4軸 X 線回折測定による超伝導薄膜配向性の 3D
Contents
1. BSCCO MgO 7 scan 6 X 3D LabVIEW 3D 3D 09 202. 3 3D BSCCO MgO LabVIEW 3D 2 4 X 3D X
3. 2 1 Schulz MgO BSCCO 1 Schultz Schulz Schultz 1mm XX X X X X A a B 360 8 B X 3 1 Schulz 90 270 1R0 2 X
4. BSCCO 3 3 4 3D BSCCO kg XX XY cps 2 9 cps XY 2 2 2 2 2 9
5. X LabVIEW 1 Bi Sr CaCu O BSCCO BSCCO MgO 1 MgO 10 BSCCO 28 6 MgO 100 BSCCO MgO 2 BSCCO 4 7 0 7 45 12 BSCCO hel X 7 1
6. 3 99 LED 6 XRD peak search scan 7 BSCCO MgO 1 w a 8 XY cps deg BSCCO MgO XY 2 2 2
7. BSCCO MgO 4 3D 3 3D 3D 3D 3D HH Ge Pe 4 3D XY 18 2011 5 3D
8. JPEG 4 5 9 9 2 2 MgO BSCCO 2 5 2D 3D 2D XRD peak search scan XRD_peak search 9 29 X 2 9 6 X
9. 2D 18 2011 1 Uchiyama T and Uchida T Control of in plane orientation of Bi 2212 thin films prepared by MOD method Tech Rep IEICE SCE 106 pp 19 24 2006 2 X pp 290 293 1990 3 X Ppp 9 16 1992 4 X Ultima IV 5 Robert HL Bishop LabVIEWTMS8 WW 2008
10. LabVIEW w LabVIEW w LabVIEW Excel o LabVIEW LabVIEW 3D 3D 3D 3D
11. X o gp 2 3 4 3 LabVIEW LabVIEW LabVIEW G G 5 LabVIEW 3D XX
12. 4 X 3D 4 X 3 3D LabVIEW XX 3D LabVIEW X 3D 2D
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