LIV-903-01B (System 25 Laser Diode Test
Contents
1. These configurations may include some or all of the following instruments e Model 2400 SourceMeter that drives the laser diode and acts as a modulator bias source in LDMs employing an integrated modulator Model 2440 5A SourceMeter Instrument that provides a 5A source and measure capability that makes it well suited for testing high power pump lasers Model 2500 Dual Photodiode Meter that uses a time saving dual channel design to facilitate simultaneous measurement of related parameters Model 2500INT Integrating Sphere that allows the system to make direct measurements of optical power with results expressed in watts The Model 2510 TEC Sourcemeter that combines high speed DC sourcing and measurement with the ability to control the operation of a laser diode module s Thermo Electric Cooler or TEC also known as a Peltier device Model 2510 AT Autotuning TEC SourceMeter that adds autotuning capability using a modified Zeigler Nichols algorithm This allows you to determine P I and D proportional integral and derivative values for closed loop temperature control so you no longer need to determine the optimal values for these coefficients experimentally Optoelectronic Solutions from Keithley Keithley offers a suite of products for electrical production test applications that support your need for accuracy and throughput Other optoelectronic solutions available from Keithley include e Model 2520 Pulsed Laser Diode Test Syst2. changing source 11 output trigger after soaking device new source current value bypass first input trigger set trigger delay to OmS 12 System 25 Laser Diode Test System Quick Setup Guide Model 2500 Dual Photodiode Meter programming The code fragment below is a subroutine that sets up the Model 2500 to measure current from both photodiodes using the 20mA range on both channels Operating modes are set as follows e Data format channel 1 and channel 2 current binary format e Channel 1 NPLCs set during program execution 0 01 to 10 e Channel 1 current range 20mA set during program execution e Channel 1 voltage bias source 10V range value checked and set during program execution e Channel 1 source delay 0 e Channel 1 ground connect mode enabled e Channel 2 NPLCs set during program execution 0 01 to 10 e Channel 2 current range 20mA set during program execution e Channel 2 voltage bias source 10V range value checked and set during program execution e Channel 2 source delay 0 e Channel 2 ground connect mode enabled e Arm source immediate bypass arm layer e Arm count 1 e Arm direction acceptor wait for trigger event e Trigger source and lines trigger link line 1 output line 2 input Trigger input wait for trigger before measuring e Output trigger trigger after settling Trigger event bypass do not bypass on first pass through trigger layer e Data store format
3. rst intStatus End If End Sub TE B USA pm ent Equipment An Interworld Highway LLC Company Specifications are subject to change without notice All Keithley trademarks and trade names are the property of Keithley Instruments Inc All other trademarks and trade names are the property of their respective companies KENT HLEY Keithley Instruments Inc Sales Offices BELGIUM CHINA FINLAND FRANCE GERMANY GREAT BRITAIN INDIA ITALY JAPAN KOREA NETHERLANDS SWEDEN TAIWAN 28775 Aurora Road e Cleveland Ohio 44139 e 440 248 0400 Fax 440 248 6168 1 888 KEITHLEY 534 8453 www keithley com Bergensesteenweg 709 B 1600 Sint Pieters Leeuw 02 363 00 40 Fax 02 363 00 64 Yuan Chen Xin Building Room 705 12 Yumin Road Dewai Madian Beijing 100029 8610 8225 1886 Fax 8610 8225 1892 Tietajantie 2 e 02130 Espoo Phone 09 54 75 08 10 Fax 09 25 10 51 00 3 all e des Garays 91127 Palaiseau C dex 01 64 53 20 20 Fax 01 60 11 77 26 Landsberger Strasse 65 82110 Germering 089 84 93 07 40 Fax 089 84 93 07 34 Unit 2 Commerce Park Brunel Road Theale Berkshire RG7 4AB 0118 929 7500 Fax 0118 929 7519 1 5 Eagles Street Langford Town Bangalore 560 025 080 212 8027 Fax 080 212 8005 Viale San Gimignano 38 e 20146 Milano 02 48 39 16 01 Fax 02 48 30 22 74 New Pier Takeshiba North Tower 13F 11 1 Kaigan 1 chome Minato ku
4. Signal CONMECUHONS corer a E ESEE 6 Control connections ssessssesesseseseeressrsrssestrstsrestesrereseeresresrnees 8 Power line connections sisessirseiseiiiiniiiserissesririire siers 9 Power up and Checkout 20 ee eee eeeceeeeseceseeseeesesseeeseeseeeaeeseeeaees 9 POWOT UP creea iE EAE A E 9 Laser diode test resistor network sessessesssseseesssessrssrrsseseese 9 Checkout procedure sssrini ir iiai 10 Instrument programming sessseesestesesreresreserresresesrsresesresreresresese 10 Model 2400 2420 2440 SourceMeter programming 10 Model 2500 Dual Photodiode Meter programming 12 Model 2510 TEC SourceMeter programming e 14 List of Illustrations Figure 1 System block diagram 00 ese seeseeeeceeeceeeeseseeeeseseeeeseeseeeaees 3 Figure 2 Suggested rack mount locations ele eee eee eeeeeseeeeeeeeseeeaees 5 Figure 3 System signal CONNECTIONS 0 eee eeeeeceeeesereeeeseeeeeeaeeseeeaees 7 Figure 4 System control CONNECTIONS lees ee eeeeeeteeeeseteeeeaeeneeeaees 8 Figure 5 Test resistor MCtWOTK irosesc enina iiae 9 Congratulations Congratulations on your purchase of Keithley s System 25 Laser Diode Test System for testing of Laser Diode Modules LDMs In applications such as yours our Laser Diode Test System has been proven to provide a complete LDM test solution including control of the thermo electric cooler TEC which is a critical part of LDM assemblies In this quick setu
5. are equivalent to the original component Note that selected parts should be purchased only through Keithley Instruments to maintain accuracy and functionality of the product If you are unsure about the applicability of a replacement component call a Keithley Instruments office for information To clean an instrument use a damp cloth or mild water based cleaner Clean the exterior of the instrument only Do not apply cleaner directly to the instrument or allow liquids to enter or spill on the instrument Products that consist of a circuit board with no case or chassis e g data acquisition board for installation into a computer should never require cleaning if handled accord ing to instructions If the board becomes contaminated and operation is affected the board should be returned to the factory for proper cleaning servicing Table of Contents TitEG AUCTION sorrie eenen ibede A 1 Standard system Configurations 0 0 eee eee eeeeeseeseeeeeeseeeseeeeeeaeees 1 Model s25 01000 General Purpose Laser Diode Test Measurement 00 eee eeeeeseceeeeseeseeeeeeseeseseeeeaeeeaeees 1 Model s25 21230 Transmitter Module 0 cee eeeeeeneeeseeeeees 2 Model s25 21210 980nm Pump Module ee eeeeeeeeeeeee 2 Model s25 41220 High Power Pump Module 2 System block diagram 0 0 eeccesesseeceseesseeceseeeeeececeeseeeeeeeseeeeaeens 3 T stallation viesis ccscedveess Seton pSeac8t rebates a dee vatees edie 4 COMME CUIONG eset A ET 6
6. the Manual Exercise extreme caution when a shock hazard is present Lethal voltage may be present on cable connector jacks or test fixtures The American National Standards Institute ANSI states that a shock hazard exists when voltage levels greater than 30V RMS 42 4V peak or 60VDC are present A good safety practice is to expect that hazardous voltage is present in any unknown circuit before measuring Operators of this product must be protected from electric shock at all times The responsible body must ensure that operators are prevented access and or insulated from every connection point In some cases connections must be exposed to potential human contact Product operators in these circumstances must be trained to protect themselves from the risk of electric shock If the circuit is capable of operating at or above 1000 volts no conductive part of the circuit may be exposed Do not connect switching cards directly to unlimited power circuits They are intended to be used with impedance limited sourc es NEVER connect switching cards directly to AC mains When connecting sources to switching cards install protective de vices to limit fault current and voltage to the card Before operating an instrument make sure the line cord is connected to a properly grounded power receptacle Inspect the con necting cables test leads and jumpers for possible wear cracks or breaks before each use When installing equipment where access to the ma
7. ED INCLUD ING ANY IMPLIED WARRANTY OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR USE THE REMEDIES PROVIDED HEREIN ARE BUYER S SOLE AND EXCLUSIVE REMEDIES NEITHER KEITHLEY INSTRUMENTS INC NOR ANY OF ITS EMPLOYEES SHALL BE LIABLE FOR ANY DIRECT INDIRECT SPECIAL INCIDENTAL OR CONSEQUENTIAL DAMAGES ARISING OUT OF THE USE OF ITS INSTRUMENTS AND SOFTWARE EVEN IF KEITHLEY INSTRUMENTS INC HAS BEEN ADVISED IN ADVANCE OF THE POSSIBILITY OF SUCH DAMAGES SUCH EXCLUDED DAM AGES SHALL INCLUDE BUT ARE NOT LIMITED TO COSTS OF REMOVAL AND INSTALLATION LOSSES SUSTAINED AS THE RESULT OF INJURY TO ANY PERSON OR DAMAGE TO PROPERTY KEITHLEY Keithley Instruments Inc 28775 Aurora Road Cleveland Ohio 44139 440 248 0400 Fax 440 248 6168 1 888 KEITHLEY 534 8453 e www keithley com Sales Offices BELGIUM Bergensesteenweg 709 B 1600 Sint Pieters Leeuw 02 363 00 40 Fax 02 363 00 64 CHINA Yuan Chen Xin Building Room 705 12 Yumin Road Dewai Madian Beijing 100029 8610 8225 1886 Fax 8610 8225 1892 FINLAND Tiet j ntie 2 02130 Espoo e Phone 09 54 75 08 10 Fax 09 25 10 51 00 FRANCE 3 all e des Garays 91127 Palaiseau C dex 01 64 53 20 20 Fax 01 60 11 77 26 GERMANY Landsberger Strasse 65 82110 Germering 089 84 93 07 40 Fax 089 84 93 07 34 GREAT BRITAIN Unit 2 Commerce Park Brunel Road Theale Berkshire RG7 4AB 0118 929 7500 Fax 0118 929 7519 INDIA 1 5 Eagles Street Langford T
8. EE USA TEquipment System 25 An Interworld Highway LLC SST RTE Laser Diode Test System Quick Setup Guide A GREIS MEASURE ONFIDENCE WARRANTY Keithley Instruments Inc warrants this product to be free from defects in material and workmanship for a period of year from date of shipment Keithley Instruments Inc warrants the following items for 90 days from the date of shipment probes cables rechargeable batteries diskettes and documentation During the warranty period we will at our option either repair or replace any product that proves to be defective To exercise this warranty write or call your local Keithley representative or contact Keithley headquarters in Cleveland Ohio You will be given prompt assistance and return instructions Send the product transportation prepaid to the indicated service facility Repairs will be made and the product returned transportation prepaid Repaired or replaced products are warranted for the balance of the original warranty period or at least 90 days LIMITATION OF WARRANTY This warranty does not apply to defects resulting from product modification without Keithley s express written consent or misuse of any product or part This warranty also does not apply to fuses software non rechargeable batteries damage from battery leakage or problems arising from normal wear or failure to follow instructions THIS WARRANTY IS IN LIEU OF ALL OTHER WARRANTIES EXPRESSED OR IMPLI
9. I and LO terminals to the laser diode module using the supplied banana to coaxial adapters and BNC to alligator cables as shown The instrument must be used in the 4 wire sense mode Model 2500 Dual Photodiode Meter Connect the INPUT jacks to the two photo diodes and or integrating sphere using the supplied triax cables as shown Connect the triax center conductor to the detector terminal labeled anode triax outer shield chassis ground to the detector terminal labeled cathode For the Model 2500INT integrating sphere make direct connections using a triax cable and Model 6172 adapter Note ground connect mode must be enabled to use this configuration When using the demo software channel 1 is the front facet and channel 2 is the back facet Model 2510 2510 AT TEC SourceMeter Connect the INPUT and OUTPUT termi nals to the TEC and temperature sensor using the supplied Model 2510 CAB cable as shown Additional cable configurations are available from Keithley Instruments Inc for other connections to the DUT Contact your local sales representative for details System 25 Laser Diode Test System Quick Setup Guide 7 Figure 3 System signal connections INPUT OUTPUT Connector Model 2510 2510 AT 2510 CAB Connections TEC SourceMeter Assumes Current Cools TEC z ra Terminal Wire Color ie Thermistor White Thermistor Blue Thermistor Yellow Thermistor Red TEC Black TEC Green TEC Brown 2510 CAB
10. Tokyo 105 0022 e 81 3 5733 7555 Fax 81 3 5733 7556 2FL URI Building 2 14 Yangjae Dong Seocho Gu Seoul 137 888 82 2 574 7778 Fax 82 2 574 7838 Postbus 559 4200 AN Gorinchem 0183 635333 Fax 0183 630821 c o Regus Business Centre Frosundaviks All 15 4tr e 169 70 Solna 08 509 04 600 Fax 08 655 26 10 13F 3 No 6 Lane 99 Pu Ding Road Hsinchu Taiwan R O C 886 3 572 9077 Fax 886 3 572 9031 Copyright 2003 Keithley Instruments Inc Printed in the U S A 2 03
11. acet detector measurement and front facet photo current Model 2510 TEC SourceMeter for temperature control of the internal TEC module 2 System 25 Laser Diode Test System Quick Setup Guide Model s25 21 230 Transmitter Module This system is configured specifically for testing of transmitter laser module in the 1330nm to 1550nm range The system includes Model 2420 SourceMeter for laser drive and forward voltage measure Model 2500 Dual Photodiode Meter for back facet detector measurement and front facet optical power Model 2510 AT Autotuning TEC SourceMeter for temperature control of the internal TEC module Model 2500INT Integrating Sphere with a cooled InGaAs detector and an FC PC input connector for optical power measurement Model s25 21210 980nm Pump Module This system is configured specifically for testing of 980nm pump laser with an input current level of 3A or less The system includes Model 2420 SourceMeter for laser drive up to 3A and forward voltage measure Model 2500 Dual Photodiode Meter for back facet detector measurement and front facet optical power Model 2510 AT Autotuning TEC SourceMeter for temperature control of the internal TEC module Model 2500INT Integrating Sphere with a silicon detector and an FC PC input connec tor for optical power measurement Model 25 41220 High Power Pump Module This system is configured specifically for testing of high power pump laser module with a 14xx wav
12. channel 1 and channel 2 currents Private Sub Setup2500 General instrument configuration Call send intKth2500 Call send intKth2500 Call send intKth2500 kk kk kkk Configure Channe form elem form data syst key 16 int 1 of 2500 Setup sense circuitry for 20mA range Ca Ca send intKt send intKt h2500 h2500 sens sens curr nplc curr rang currl curr2 sre bord swap System 25 Laser Diode Test System Quick Setup Guide intStatus intStatus Status Kk k k k k k k k k amp comboNPLC amp textN1CurrRange Setup source to bias the front facet photodiode Ca If DE Ca Ca Ca send intKt textN1Bias gt textN1Bias lt send intKt send intKt send intKt kk kk kkk h2500 h2500 h2500 h2500 Configure 10 Then Setup sense circuitry for 20mA range Ca Ca send intKt send intKt h2500 h2500 sens2 curr nplc sens2 curr rang sourl volt range 10 intStatus textN1Bias 10 10 Then textN1Bias 10 ssourl volt amp textN1Bias intStatus sourl delay 0 intStatus sourl gcon 1 intStatus Channel 2 of 2500 KER EE EEE amp comboNPLC amp textN2CurrRange Setup source to bias the photodiode with 5V Ca If If Ca Ca Ca send intKt textN2Bias gt textN2Bias lt send intKt send intKt send intKt Setup Trigger Model layer to synch with trigger from 24
13. de Test System Quick Setup Guide Installation The instruments for the Laser Diode Test System are shipped configured for bench top use If system rack mounting is desired the necessary rack mounting kits are provided Follow the steps below to rack mount the instruments NOTE See the documentation provided with the supplied Model 4288 1 and 4288 2 rack mount kits for more detailed information on attaching rack mount hardware 1 First determine the desired location of each instrument Figure 2 shows suggested mounting locations Be sure to allow sufficient air space above and below the instru ments as shown for proper ventilation 2 Remove the handles and feet from the instruments then attach the necessary rack mounting hardware 3 Slide the instruments into the rack then secure them with four mounting screws ipment L INET An Interworld Highway LLC Company System 25 Laser Diode Test System Quick Setup Guide 5 Figure 2 Suggested rack mount locations 1U 1 75 Air Space Model 2400 2420 or 2440 SourceMeter 1U 1 75 Air Space Model 2510 2510 AT TEC SourceMeter Model 2500 Dual Photodiode Meter 6 System 25 Laser Diode Test System Quick Setup Guide Connections Signal connections Using Figure 3 as a guide make signal connections as follows NOTE Model 2400 2420 2440 SourceMeter Connect the rear panel INPUT OUTPUT and SENSE H
14. del 7007 Interface GPIB Cabl PC Computer ai System 25 Laser Diode Test System Quick Setup Guide 9 Power line connections Connect instrument power line inputs to a grounded power outlet using the supplied line cords Make certain that the power line voltage is within the range specified on the rear panel of each instrument Power up and checkout Power up Turn on the power to all instruments and verify that they all go through their normal power up cycles Note the IEEE 488 address that is shown on the bottom line of the display as part of the power up cycle for example SCPI Addr 25 Be sure to use that address in your program or change the addresses to the desired settings Use the COMMUNICATION GPIB selection in the main MENU Laser diode test resistor network Figure 5 shows a schematic diagram of a resistive network that can be used to check out your system These resistors can be mounted in a shielded component box that is equipped with banana jacks for connections to 2400 2420 2440 INPUT OUTPUT HI and LO as well as two triax jacks for connections to the two Model 2500 INPUT jacks INPUT OUTPUT LO Figure 5 Test resistor network Model 2400 2420 2440 Shielded Model 2500 SourceMeter Component Box Dual Photodiode Meter ne l A Channel 2 INPUT OUTPUT HI O Re Triax INPUT l l A Channel 1 l T rO Triax INPUT l 10 Sy
15. elength The system includes Model 2440 SourceMeter for laser drive up to 5A and forward voltage measure Model 2500 Dual Photodiode Meter for back facet detector measurement and front facet optical power Model 2510 AT Autotuning TEC SourceMeter for temperature control of the internal TEC module Model 2500INT Integrating Sphere with a germanium detector and an FC PC input connector optical power measurement System 25 Laser Diode Test System Quick Setup Guide 3 System block diagram Figure 1 shows an overall block diagram of the Laser Diode Test System Components include e Model 2400 2420 2440 SourceMeter sources current to the laser diode module and measures voltage across the device e Model 2500 Dual Photodiode Meter Biases and measures currents from the two photo diode detectors e Model 2510 2510 AT TEC SourceMeter Controls the TEC thermo electric cooler power to maintain the laser diode module at the desired temperature e Model 2500INT Integrating Sphere Provides optimal coupling of light from laser diode module to integral Ge Si or InGaAs photodiode detector not included in Model LIV 1 Trigger Link synchronizes instrument readings GPIB interfaces the instruments to the controlling computer Figure 1 System block diagram Trigger Link Thermistor Laser GPIB 2400 2420 2440 GPIB LDM Laser Diode Module Device Under Test 2500INT 4 System 25 Laser Dio
16. em that combines high speed current pulsing with measurement capabilities for precision testing at earlier stages of production without the damaging effects of device heating The Model 4200 Semiconductor Characterization System that combines high resolution DC source and measurement with real time plotting and analysis for material and device character ization and development Keithley s RF Microwave Signal Routing Systems for switching and conditioning of high data rate signals up to 40GHz System 25 Laser Diode Test System Quick Setup Guide Introduction This guide provides basic information on setting up and using the System 25 Laser Diode Test System which combines all the necessary DC measurement capabilities to test laser diode modules For more detailed information on each of the instruments in the Laser Diode Test System refer to the corresponding user s manual supplied with each unit Standard system configurations The standard system configurations below are supplied with all the cables and adapters required for communication triggering and connection to the device to be tested Also included is all the necessary hardware for rack mounting the instruments Model s25 01000 General Purpose Laser Diode Test Measurement This system is configured as a general purpose system The system includes Model 2400 SourceMeter for laser drive and forward voltage measure e Model 2500 Dual Photodiode Meter for back f
17. equately trained Operators use the product for its intended function They must be trained in electrical safety procedures and proper use of the instrument They must be protected from electric shock and contact with hazardous live circuits Maintenance personnel perform routine procedures on the product to keep it operating properly for example setting the line voltage or replacing consumable materials Maintenance procedures are described in the manual The procedures explicitly state if the operator may perform them Otherwise they should be performed only by service personnel Service personnel are trained to work on live circuits and perform safe installations and repairs of products Only properly trained service personnel may perform installation and service procedures Keithley products are designed for use with electrical signals that are rated Installation Category I and Installation Category II as described in the International Electrotechnical Commission IEC Standard IEC 60664 Most measurement control and data T O signals are Installation Category I and must not be directly connected to mains voltage or to voltage sources with high tran sient over voltages Installation Category II connections require protection for high transient over voltages often associated with local AC mains connections Assume all measurement control and data I O connections are for connection to Category I sourc es unless otherwise marked or described in
18. est fixture keep the lid closed while power is applied to the device under test Safe operation requires the use of a lid interlock If or Pe is present connect it to safety earth ground using the wire recommended in the user documentation The A symbol on an instrument indicates that the user should refer to the operating instructions located in the manual The A symbol on an instrument shows that it can source or measure 1000 volts or more including the combined effect of normal and common mode voltages Use standard safety precautions to avoid personal contact with these voltages The WARNING heading in a manual explains dangers that might result in personal injury or death Always read the associated information very carefully before performing the indicated procedure The CAUTION heading in a manual explains hazards that could damage the instrument Such damage may invalidate the war ranty Instrumentation and accessories shall not be connected to humans Before performing any maintenance disconnect the line cord and all test cables To maintain protection from electric shock and fire replacement components in mains circuits including the power transformer test leads and input jacks must be purchased from Keithley Instruments Standard fuses with applicable national safety ap provals may be used if the rating and type are the same Other components that are not safety related may be purchased from other suppliers as long as they
19. in power cord is restricted such as rack mounting a separate main input pow er disconnect device must be provided in close proximity to the equipment and within easy reach of the operator For maximum safety do not touch the product test cables or any other instruments while power is applied to the circuit under test ALWAYS remove power from the entire test system and discharge any capacitors before connecting or disconnecting ca 5 02 bles or jumpers installing or removing switching cards or making internal changes such as installing or removing jumpers Do not touch any object that could provide a current path to the common side of the circuit under test or power line earth ground Al ways make measurements with dry hands while standing on a dry insulated surface capable of withstanding the voltage being measured The instrument and accessories must be used in accordance with its specifications and operating instructions or the safety of the equipment may be impaired Do not exceed the maximum signal levels of the instruments and accessories as defined in the specifications and operating in formation and as shown on the instrument or test fixture panels or switching card When fuses are used in a product replace with same type and rating for continued protection against fire hazard Chassis connections must only be used as shield connections for measuring circuits NOT as safety earth ground connections If you are using a t
20. nH TEC Orange 5 E Cable l Center Conductor Anode BNC Outer Shield Cables Cathode INPUT Note Enable Ground Connect Mode Thermistor Laser Cables Model 2500 Dual Photodiode Meter 6172 Adapter Center Conductors SENSE HI INPUT OUTPUT HI INPUT Model 2500INT OUTPUT LO Integrating Sphere erwgl OPERATOR SESVICABLE PARTS SERVICE BY QUALIFIED PERSONNEL ONLY om Model 2400 2420 2440 a SENSE LO SourceMeter 8 System 25 Laser Diode Test System Quick Setup Guide Control connections Refer to Figure 4 for the following control connections GPIB connections Connect the rear panel IEEE 488 connectors of each instrument to the IEEE 488 interface of the next instrument and then to the computer interface using the supplied Model 7007 GPIB cables Trigger link connections Connect the rear panel TRIGGER LINK connectors of the Model 2400 2420 2440 and Model 2500 together using the supplied Model 8501 trigger link cable Figure 4 System control connections WARNING NO INTERNAL OPERATOR SERVICABLE PARTS SERVICE BY QUALIFIED PERSONNEL ONLY w ewe Model 2510 a 2510 AT TEC SourceMeter IEEE 488 Model 2500 Dual Photodiode Meter Model 2400 2420 2440 SourceMeter Model 8501 Trigger Link Cable TRIGGER LINK TRIGGER LINK IEEE 488 Mo
21. new Revision includes a revised copy of this print history page Revision A Document Number LIV 903 01 ccceesesssseeseseeeeseeeeseeeceecseeseeeeeeaeeaeeeeaees June 2001 Revision B Document Number LIV 903 01 oo ccesessesessseesescseesesescseeeeesseseeeeseseeees April 2003 All Keithley product names are trademarks or registered trademarks of Keithley Instruments Inc Other brand names are trademarks or registered trademarks of their respective holders KEUS Safety Precautions The following safety precautions should be observed before using this product and any associated instrumentation Although some instruments and accessories would normally be used with non hazardous voltages there are situations where hazardous conditions may be present This product is intended for use by qualified personnel who recognize shock hazards and are familiar with the safety precautions required to avoid possible injury Read and follow all installation operation and maintenance information carefully before us ing the product Refer to the manual for complete product specifications If the product is used in a manner not specified the protection provided by the product may be impaired The types of product users are Responsible body is the individual or group responsible for the use and maintenance of equipment for ensuring that the equip ment is operated within its specifications and operating limits and for ensuring that operators are ad
22. own Bangalore 560 025 080 212 8027 Fax 080 212 8005 ITALY Viale San Gimignano 38 20146 Milano 02 48 39 16 01 Fax 02 48 30 22 74 JAPAN New Pier Takeshiba North Tower 13F 11 1 Kaigan 1 chome Minato ku Tokyo 105 0022 81 3 5733 7555 e Fax 81 3 5733 7556 KOREA 2FL URI Building 2 14 Yangjae Dong Seocho Gu Seoul 137 888 82 2 574 7778 Fax 82 2 574 7838 NETHERLANDS Postbus 559 4200 AN Gorinchem 0183 635333 Fax 0183 630821 SWEDEN c o Regus Business Centre Frosundaviks All 15 4tr e 169 70 Solna 08 509 04 600 Fax 08 655 26 10 TAIWAN 13F 3 No 6 Lane 99 Pu Ding Road Hsinchu Taiwan R O C 886 3 572 9077 Fax 886 3 572 9031 1 03 System 25 Laser Diode Test System Quick Setup Guide 2001 Keithley Instruments Inc All rights reserved Cleveland Ohio U S A Second Printing April 2003 Document Number LIV 903 01 Rev B Manual Print History The print history shown below lists the printing dates of all Revisions and Addenda created for this manual The Revision Level letter increases alphabetically as the manual undergoes sub sequent updates Addenda which are released between Revisions contain important change in formation that the user should incorporate immediately into the manual Addenda are numbered sequentially When a new Revision is created all Addenda associated with the previous Revision of the manual are incorporated into the new Revision of the manual Each
23. p guide you will find information that will enable you to configure install make signal connections perform power up and checkout begin programming The rest of this section provides an overview of our Laser Diode Test System Your system is either a custom configuration or one of the following standard configurations e s25 01000 General Purpose Laser Diode Test System previously LIV part number LIV 1 s25 21230 Transmitter Module Laser Diode Test System previously LIV part number LIV 2 s25 21210 980nm Pump Laser Diode Test System previously LIV part number LIV 3 s25 41220 High Power Pump Module Laser Diode Test System previously LIV part number LIV 4 s25 02000 General Purpose Laser Diode Test System with Fixture TEC Control previously LIV part number LIV 1 F 25 22230 Transmitter Module Laser Diode Test System with Fixture TEC Control previously LIV part number LIV 2 F 25 22210 980nm Pump Laser Diode Test System with Fixture TEC Control previously LIV part number LIV 3 F s25 42220 High Power Pump Module Laser Diode Test System with Fixture TEC Control previously LIV part number LIV 4 F The basic configuration can be easily modified to allow for new connections or expansion with new measurement and control functions such as other Keithley meters and switching systems A demonstration software package created in Visual Basic provides you with a head start in programming your specific laser diode test system application
24. rce is configured for the sweep from textStartCurrent to textStopCurrent in steps defined by textStepCurrent The sweep will use the best fixed range to prevent the inherent dicontinuities of range changing from being seen by the The source delay is also set to accommodate the cable and analysis code as kink DUT capacitive loading Call send intKth24x0 Call send intkKth24x0 Call send intKth24x0 Call send intKth24x0 Call send intKth24x0 Call send intKth24x0 Call send intKth24x0 Call send intKth24x0 Sour Sour sour sour sour sour sour sour func curr curr curr curr curr intStatus start amp textStartCurrent stop amp textStopCurrent step amp textStepCurrent mode sweep intStatus swe rang best intStatus swe spac lin intStatus del amp txtSourceDelay intStatus source current intStatus set start min intStatus set stop max intStatus set step enable sweep mode use best fixed range select linear sweep set source delay The 24x0 will source current and measure the forward junction voltage Both current and voltage will be passed to the analysis portion of the code across the laser diode Ca send intKth24x0 Ca send intKth24x0 Ca send intKth24x0 Ca send intKth24x0 Ca send intKth24x0 Ca send intKth24x0 Ca send intKth24x0 sens sens func volt
25. stem 25 Laser Diode Test System Quick Setup Guide Checkout procedure Instruments can be checked for proper operation using the resistor network in Figure 5 as follows e Model 2400 2420 2440 Select SOURCE I MEASURE V then set the source current to 50mA Turn on the output then verify that the measured voltage is approximately 5V e Model 2500 Set the Model 2400 2420 2440 for SOURCE V then set the output volt age to 5V Turn on the output then verify that the displayed Model 2500 channel 1 reading is approximately 5mA and the displayed Model 2500 channel 2 reading is about 1mA Instrument programming Several demonstration applications are provided on the software disk supplied with your Laser Diode Test System Included is a Labview application and several Visual Basic VB applications specific to the type of interface card These programs are fully functional and can be easily modified for your specific purposes The following section provides details regarding the function of one of the VB applications provided This information will aid your modification effort to taylor the applications to your specific needs Model 2400 2420 2440 SourceMeter programming The code fragment below is a subroutine that sets up the SourceMeter for a laser diode current sweep while measuring laser diode voltage Various operating modes are programmed as follows e Beeper off e Auto zero off for maximum speed e Remote sensing on 4
26. t for input trigger before output trigger after setting do not bypass on first pass 13 display to show both channels set NPLC using input Param set NPLC using input Param 14 System 25 Laser Diode Test System Quick Setup Guide Model 2510 TEC SourceMeter programming The code fragment shown below is a subroutine that conditionally sets up the following Model 2510 operating modes Current protection limit 1A Sensor type thermistor Thermistor sensor current range auto Thermistor sensor measurement range 10kQ Temperature setpoint set during program execution Private Sub comboTempOnOff Click intStatus 1A current limit Thermistor sensor type Auto sensor current range 10k ohm sensor resistance range Program setpoint Turn on output Get TEC AC resistance If comboTempOnOff Text ON Then Ca send intKth2510 rst intStatus Ca send intKth2510 sens curr prot lev 1 0 intStatus t Ca send intKth2510 sens temp tran ther intStatus t Ca send intKth2510 sens temp curr auto on intStatus Ca send intKth2510 sens temp ther range 1e4 intStatus t Ca send intKth2510 sour temp spo amp comboTempSetPoint Text Ca send intKth2510 outp on intStatus Ca send intKth2510 meas res ac intStatus Ca enter strData 100 intLength intKth2510 intStatus txtTECRes Text strData Ca send intKth2510 outp on intStatus Else Ca send intKth2510
27. volt sens sens sens form volt func elem format data sre bord swap nplc amp comboNPLC intStatus conc off intStatus volt intStatus prot 5 intStatus range 20 intStatus volt curr intStatus Ca send intKth24x0 stat meas enab 512 intStatus Ca send intKth24x0 sre 1 intStatus intStatus set NPLC per input param turn off concurrent meas sense voltage V forward of LD limit output voltage to 5V read both voltage and current binary format mask buffer full byte mask measurement summary bit for SRQ Trigger layer is used to keep track of triggers from the front facet photodetector meter Ca send intKth24x0 Ca send intKth24x0 Ca send intKth24x0 Ca send intKth24x0 Ca send intKth24x0 Ca send intKth24x0 Ca send intKth24x0 Ca send intKth24x0 Ca send intKth24x0 Ca send intKth24x0 End Sub The trigger count will be set later arm sour imm intStatus arm count inf intStatus sprig trig trig ttrig strig Taka E trig sbrigy clear intStatus sour ilin olin tlink intStatus 1 intStatus 2 intStatus input source intStatus outp del intStatus dir source intStatus delay 0 intStatus bypass arm layer clear triggers use trigger link input trigger on line 1 output trigger on line 2 wait for input trigger before
28. wire connections Terminals rear e Source function current e Start current set during program execution 10mA minimum e Stop current set during program execution 1A maximum Step current set during program execution start step 10 minimum e Current source mode linear sweep best fixed source range e Source delay and NPLCs set during program execution e Sense function concurrent functions disabled voltage function enabled Voltage limit 5V e Voltage measurement range 20V e Data elements both voltage and current binary format e SRQ generate SRQ when buffer is full e Arm source and count immediate source infinite count bypass arm layer Trigger source and lines trigger link line 1 input line 2 output e Source trigger wait for input trigger before changing source bypass first trigger Trigger output output trigger after delay phase of SDM cycle e Trigger delay Oms Private Sub Setup24x0 System 25 Laser Diode Test System Quick Setup Guide Setup SourceMeter tm system commands Call send intKth24x0 syst beep stat off intStatus Call send intKth24x0 syst azer stat off intStatus Call send intKth24x0 syst rsen 1 intStatus Call send intKth24x0 display enable off intStatus Call send intKth24x0 rout term rear intStatus disable beeper disable auto zero for speed enable four wire measurements disable display use rear terminals The sou
29. x0 Ca Ca Ca Ca Ca Ca Ca Ca Ca Ca Ca intKt intKt intKt intKt intKt intKt intKt intKt intKt intKt send send send send send send send send send send send intKt End Sub h2500 h2500 h2500 h2500 h2500 h2500 h2500 h2500 h2500 h2500 h2500 Bypass both arm layers and use trigger sarm sour imm sarm coun 1 sarm dir acc strig clear strig sour tlink Wetrig zilin 2 strig olin 1 trig input sense trig outp sense strig dir acceptor strac feed calc3 ca h2500 sour2 volt range 10 intStatus 10 Then textN2Bias 10 10 Then textN2Bias 10 h2500 sour2 volt amp textN2Bias intStatus h2500 sour2 delay 0 intStatus h2500 sour2 gcon 1 intStatus intStatus intStatus intStatus intStatus intStatus intStatus intStatus intStatus intStatus intStatus 1c4 intStatus intStatus intStatus output only current readings binary format toggle intStatus 20mA range set range to 10V set bias output set source delay to zero enable ground connect relay intStatus 20mA range set range to 10V set bias output set source delay to zero enable ground connect relay bypass arm layer 1 set scan count wait for trigger event clear triggers use trigger link input trigger on line 2 output trigger on line 1 wai
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