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User`s Manual GW-uni

1. 40 5 Operation Sequence 41 6 Key Function Map 42 7 On Board Program 43 8 Electrical Characteristics 46 9 Special Notice 46 10 Adapter Socket Table 47 GW uni SAMSUNG MCU gang programmer 1 Overview GW uni is the gang programmer for all SAMSUNG MCU with standard serial writing The Gang programmer consists of a master unit GW uni which connects to various programming adapter sockets for programming all devices with a different package This gang programmer can program 8 devices with very fast programming speed once It is good for mass production A data is saved in GW uni memory by PC so it works without PC Stand alone mode User can easily set a device information by a device part number selection 1 1 Features and Specifications 1 Support all SAMSUNG MCUs with Standard Serial Writing 2 Internal Memory 100Mbyte 3 4 GW uni setup and initialize with PC application program Stand alone operation mode without PC GW uni should be setup by PC
2. 30 4 4 Verification mode 31 4 5 Erase mode 32 4 6 Blank check mode 33 4 7 Device checksum mode 34 4 8 Buffer checksum mode 35 4 9 Menu mode 36 4 10 Device setting 37 4 11 Program option 37 4 12 Read Device 38 4 13 Program count 39 4 14 Beep sound 39 4 15 Information 39 4 16 Return 39 4 17 Result ere rere mm 40 4 18 Socket LED
3. VPPM 5 0 Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Dump Connected Figure 3 16 1 Dump execution 2 Address is changed by lt lt and gt gt button 3 Buffer Memory Display buffer memory data 4 Device lt Socket 1 gt Display device ROM data in a socket 1 test 01 FF _32K bin GW uni Device Samsung MCU S3F8419 5 Dump Data 01 02 03 98 03 oA 0B ac ub Address 000000 00 01 02 03 08 09 OA 0B OC OD 00001010 11 12 13 18 19 1A 1B 1C 1D lt lt 000000 gt gt 000020 20 21 22 23 28 29 2A 2B 2C 2D 000030 30 31 32 33 38 39 3A 3B 3C 3D 000040 41 42 43 48 49 4A 4B 4C 4D 000050 51 52 53 58 59 5A 5B 5C 5D Dump 000060 60 61 62 63 68 69 6A 6B 6C 6D Buffer Memory 000070 71 72 73 78 79 7A 7B 7C 7D 000080 81 82 83 88 89 8A 8B 8C 8D Device lt Socket 1 gt 000090 91 92 93 98 99 9A 9B 9C 9D gt 000040 Al A2 A3 A8 A9 AA AB AC AD 000080 B1 B2 B3 B8 B9 BA BB BC BD ooo00co C1 c2 C3 C8 C9 CA CB CC CD 0000D0 D1 D2 D3 D8 D9 DA DB DC DD 0000E0 El E E3 E8 E9 EA EB EC ED 0000F0 Fo Fi F2 F3 F8 F9 FA FB FC FD EXIT SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET it8 Ready Connected Figure 3 16 2 Dump window 19 SSEMINI GW uni SAMSUNG MCU gang programmer 3 17 Read Buffer Read data in buffer memory and
4. C000 Checksum C000 Iv Auto Blank Checking T F Auto Read Protection Lae Checksum vDDM 5 0 Auto LDC Protection F Auto Hard Lock VEE 5 0 f SMART Option Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Buffer Checksum Connected Figure 3 15 Buffer Checksum 18 SSEMINI GW uni SAMSUNG MCU gang programmer 3 16 Dump Display buffer memory or device ROM data 1 Execute the Dump window after clicking the dump icon 5 test 01 FF _32K bin GW uni File Execution Program Option Help Device Samsung MCU S3F8419 Barer M cS mit tlala View the data of device or data of buffer memory on PC screen Data Information F 3 ou Download Start Address 00000000 Success Num 000001 Success D End Address 00007FFF Fail Num 000007 PROGRAM TRETT U rage l Checksum cooo Clear Count Block Check Writing GW uni Setting Information Operation Option Verification DES S3F649 Key Lock lete complete Password Change Verify Start Address 00000000 z complete Program Option End Address 00007FFF IV Auto Chip Erase Device Checksum IV Auto Verification C000 Checksum c000 V Auto Blank Checking EE Auto Read Protection LEDET Checksum vDDM 5 0 I Auto LDC Protection M F Auto Hard Lock I SMART Option
5. Ready SOCKET 6 SOCKET 7 SOCKET 8 Connected Figure 3 7 2 VPP setting 12 SENMINIX GW uni SAMSUNG MCU gang programmer 3 8 Program count 1 Success Num Display the number of program success 2 Fail Num Display the number of program fail Cm test 01 FF _32K bin File Execution Program Option Help GW uni e amp B m Bb Ba Data Information Start Address 00000000 End Address 00007FFF Checksum cooo GW uni Setting Information sad Start Address 00000000 End Address 00007FFF con a mw Device Samsung MCU S3F8419 GBL c owe H GW uni is connected Program Count Success Num 000003 Fail Num 000021 Operation Option F Key Lock Password Change Program Option IV Auto Chip Erase IV Auto Verification IV Auto Blank Checking F Auto Read Protection F Auto LDC Protection F Auto Hard Lock iv SMART Option Open HEX File C WProjectsWTest filelitest 01 FF 32K bin PROGRAM Erase Block Check Writing Verification complete Device Chip Erase complete Checksum Blank Check complete VDD V VPP Socket State SUCCESS FAIL FAIL Connected Figure 3 8 1 Program Count 3 The initialization window of Success Num and Fail Num is showed after click the Clear Count button 4 The count is initialized when user puts a password on Password blank in Clear co
6. E A End Address Hex 4 Checksum Buffer Checksum Hex 4 3 Program mode Program standing state RS PROGRAM Device S3F9454 Vdd 5 0 Vpp 12 5 Figure 4 3 1 Program Mode 1 Touch PROGRAM key and execute the program mode Es E Device S3F9454 lt Write gt Figure 4 3 2 Program Mode Write to a device 2 3 4 5 Execute a program option together Touch the RIGHT key for Verification mode Touch the LEFT key for Buf Checksum mode Touch the MENU key for Menu mode wae wa 2 30 SSE amp MINI GW uni SAMSUNG MCU gang programmer 4 4 Verification mode Ad VERIFICATION Device S3F9454 Vdd 5 0 Vpp 12 5 Figure 4 4 1 Verification Mode 1 Touch the PROGRAM key for verify RE Device S3F9454 lt Verify SMCU gt Figure 4 4 2 Verification mode Verify 2 Touch the RIGHT key for Erase mode 3 Touch the LEFT key for Program mode 4 Touch the MENU key for Menu mode 31 semmn lt GW uni SAMSUNG MCU gang programmer 4 5 Erase mode Make a device ROM initialize Oxff RS ERASE Device S3F9454 Vdd 5 0 Vpp 12 5 Figure 4 5 1 Erase Mode 1 Touch the PROGRAM key for erase Ex E Device S3F9454 lt ERASE gt Figure 4 5 2 Erase Mode Erase 2 Touch the RIGHT key for Blank Check mode 3 Touch the LEFT key for Verification mode 4 Touch the MENU key for Menu m
7. Figure 4 12 3 Read Device Loading 5 Back to a previous mode when Read Dewvice is finished This Read Device can t be used if there is the Key lock setting 38 SSE amp MINI GW uni SAMSUNG MCU gang programmer 4 13 Program Count 1 Success The number of program success 2 Fail The number of program fail Program Count Success 000000 Fail 000000 Figure 4 13 Program Count 4 14 Beep Sound On and off beef sound Beep Sound ON OFF Figure 4 14 Beep Sound 4 15 Information 1 Display a hardware version 2 Display a software version 3 Display a buffer memory size INFORMATION H W Ver 1 0 S W Ver 1 0 Memory 128 MB Figure 4 15 Information 4 16 Retum Back to the previous mode Program Mode Verification Mode Erase Mode 39 SSE amp MINI GW uni SAMSUNG MCU gang programmer 4 17 Result 1 Display an operating result of each socket 2 Display G with programming success Display F with programming fail RESULT Figure 4 17 Display LCD Result 4 18 Socket LED State LED RED LED GREEN Stand By OFF ON Execute Function X X Success Result Fail Table 4 18 Socket LED Description 40 SSE amp MINI GW uni SAMSUNG MCU gang programmer 5 Operation Sequence GW uni Power On Execute PC Applic
8. Found New hardware Wizard dialog 2 Select C Program Files seminix GW uni drives and finish the setup 2 4 GW uni Configuration Socket connection port LCD panel 3 Touch Key Power switch Adapter connection port USB connection port o or Figure 2 4 GW uni configuration Front Side 8 SSE amp MINI GW uni SAMSUNG MCU gang programmer 3 PC Application Program 3 1 PC application program 1 Selection a device for program and send information of device to GW uni 2 3 4 5 Download a data for program to GW uni buffer memory Set Program Option Program count can be cleared was 2 WH Execute Erase Write Verify Blank Check Device Checksum Buffer Checksum Dump and Read Buffer 7 GW uni software upgrade 3 2 Hardware setup 1 2 3 4 Connect a power adapter to GW uni and turn on the power Connect GW uni to PC by USB cable Put a adapter socket in GW uni e gt wa Put a device chip in a socket adapter Figure 3 2 GW uni Hardware setup 4 SSEMINI GW uni SAMSUNG MCU gang programmer 3 3 USB Connection 1 Execute the application program and click the USB connection icon Gn ASS GW uni Eile Execution Program Option Help Device me Data Information Program Count Start Address Success Num End Address Fail Num Checksum Clear Count GW uni Setting Information Operation Option D Device Key Lock Pass
9. 4 8 1 Device checksum mode 1 Touch the PROGRAM key for Buffer Checksum Buffer Checksum E A OxXXXXXXXX C A OxXXXXXXXX Figure 4 8 2 Buffer Checksum Loading Buffer Checksum Buffer Memory E A OxXXXXXXXX CheckSum OxXXXX Figure 4 8 3 Buffer Checksum Done 2 Touch the RIGHT key for Program mode 3 Touch the LEFT key for DVC Check mode 4 Touch the MENU key for Menu mode E A End Address C A Current Address Checksum 2byte 35 SSE amp MINI GW uni SAMSUNG MCU gang programmer 4 9 Menu mode Touch the key for Menu mode in Program Mode Verification Mode and Erase Mode Menu Device Checksum Buffer Checksum Program Count Figure 4 9 1 Menu Mode 1 Menu 1 Device Setting Set a device value by part no 2 Program Option Select a program option 3 Read Device Read a device ROM data and save it to a buffer memory 4 Program Count Display the programed device number 5 6 7 Beep Sound On and off the beep sound Information Display GW uni information Return Return to previous mode 2 2 EZ Zz wo 2 Display the chosen menu with an inverted color 3 Menu can be changed by UP and DOWN key 4 Touch the MENU key to select a chosen menu 5 Touch the PROGRAM key for a previous mode 86 SSE amp MINI GW uni SAMSUNG MCU gang programmer 4 10 Device Setting Change system setting value depending on a chos
10. FAIL Connected Figure 3 8 4 Clear Program Count 14 SSEMINI GW uni SAMSUNG MCU gang programmer 3 9 Data download 1 Save the selected file data device information and program options etc to GW uni internal memory 5 test 01 FF _32K bin GW uni File Execution Program Option Help Device Samsung MCU S3F8419 z voo sov 2c wiw c srat Ha zi VPP 5 0v GW unl is connected Download a TET file to the buffer memory of GW uni gram Count Start Address 00000000 Open HEX File m C Projects Test filetttest End Address 00007FFF 01 FF 32K bin Checksum com GW uni Setting Information Device S3F849 Start Address 00000000 End Address 00007FFF Checksum com VDD V 50 VPPI 50 Socket State Operation Option Program Option Success Num 000000 Fail Num 000000 Key Lock Password Change IV Auto Chip Erase IV Auto Verification IV Auto Blank Checking Auto Read Protection Auto LDC Protection F Auto Hard Lock iv SMART Option SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 Download SOCKET 8 Connected Figure 3 9 1 Download 2 Display the message Download Success after download 3 Display information on GW uni Setting Information window after download Om test 01 FF 32K bin GW uni Eile Execution Program Option Help
11. SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Ready Connected Figure 3 19 3 Finish Password Change A password is not set at first Password can be set to maximum 8 words Password is not set when New Password blank box is not filled 05 SEMINIX GW uni SAMSUNG MCU gang programmer 3 20 Socket state Display an operating result on each socket 5 test 01 FF _32K bin GW uni Eile Execution Program Option Help Device Samsung MCU S3F8419 yoo sov ot Wm UD Ia CCSD amp X GW uni is connected Data Information 1 Start Address 00000000 End Address 00007FFF Checksum cooo GW uni Setting Information S3F8419 Program Count Success Num 000003 Fail Num 000021 Operation Option F Key Lock Password Change Program Option IV Auto Chip Erase IV Auto Verification IV Auto Blank Checking F Auto Read Protection F Auto LDC Protection F Auto Hard Lock iv SMART Option Open HEX File C WProjectsWTest filelitest 01 FF 32K bin PROGRAM Erase Block Check Writing Verification complete Device Start Address 00000000 Chip Erase 00007FFF complete End Address Checksum cooo Blank Check complete vDDM 5 0 VPP 5 Socket State SUCCESS FAIL Connected Figure 3 20 Display a socket state 3 21 State window Display an operating result on the Socket State window
12. a device and can t erase device ROM data in user program mode 7 SMART Option 2 Process of program option 1 Chip Erase Auto Chip Erase 2 Blank Check Auto Blank Checking 3 Data Write 4 SMART Option Write SMART Option 5 Verify Auto Verification 6 SMART Option Verify SMART Option 7 Read Protection Auto Read Protection 8 LDC Protection Auto LDC Protection 9 Hard Lock Auto Hard Lock Om test 01 FF _32K bin GW uni File Execution Program Option Help Device Samsung MCU S3F8419 VDD 5 ver sov ac MEO GW uni is connected Data Information Program Count StartAddress 00000000 Success Num 000000 Open HEX File joo C Projects Test filetttest End Address 00007FFF Fail Num 000000 01 FF 32K bin Checksum cooo _ ClearCout GW uni Setting Information Operation Option Key Lock Password Change Program Option End Address 00000000 IV Auto Chip Erase pu IV Auto Verification Checksum 0000 IV Auto Blank Checking ses IV Auto Read Protection vDD V 5 0 iv Auto LDC Protection 2 iv vePM 50 D Su Hard Lock Device S3F84I9 Start Address 00000000 Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Ready Connected Figure 3 6 1 Program Option 10 SEMINIX GW uni SAMSUNG MCU gang programmer 3 There is an unavailable option depending on a sel
13. application program for the stand alone mode in advance 5 6 7 Program maximum 8 devices once Display a current state and a working state by LCD Device selection can be set by a device part number ewe DH a Program Data programming to a device Other functions can be worked with program option 9 Program Option Auto Chip Erase Erase before program Auto Verification Verify after program Read Protection A device ROM data can t be read LDC Protection Programmed code in a device isn t read in user program mode Hard Lock Can t program in a device and can t erase device ROM data SMART Option 10 Erase Erase a device ROM data 11 12 13 14 Verify Compare a butter memory data to a device data 5 Dump Display a device ROM data or a buffer memory data Blank check Check a device ROM data initialized OxFF Device Checksum Display a checksum of a device in the first socket Buffer Checksum Display a checksum of GW uni buffer memory data 1 16 Read buffer Save a buffer memory data as a PC file Intel hex format 17 Read device Save a device ROM data in buffer memory 18 Program counter Display the number of programed device 19 Key Lock Restrict functions in stand alone mode 20 21 Password Change Change a password GW uni setting information Display GW uni setting information 1 SSE amp MINI GW uni SAMSUNG MCU gang programmer 22 S
14. c au GW uni is connected Data Information Program Count Start Address 00000000 Success Num 000000 Open HEX File n C Projects Test filetttest End Address 00007FFF Fail Num 000000 017FF 32K bin Clear Count Download Success Password Change Password Password Change New Password S gram Option Change Auto Chip Erase Auto Verification Auto Blank Checking Auto Read Protection F Auto LDC Protection F Auto Hard Lock NEFT 5 0 I4 SMART Option Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Ready Connected Figure 3 19 2 Password Change dc SSEMINI GW uni SAMSUNG MCU gang programmer 3 A message window about a result is displayed after changing password Fy test 01 FF 32K bin GW uni Device Samsung MCU S3F84I9 c voo sov gt BL er D FARR p Ha GW uni is connected Data Information Program Count Start Address 00000000 Success Num 000000 Open HEX File C 4Projects Test filetitest End Address 00007FFF Fail Num 000000 01 FF 32K bin Clear Count Download Password Change Success GW uni d Success Password Changedl Passwoniehange gram Option Auto Chip Erase Auto Verification Auto Blank Checking Auto Read Protection VDD I Auto LDC Protection F Auto Hard Lock EEO 5 0 f SMART Option Socket State SOCKET 1 SOCKET 2
15. of GW uni from user s careless mistake 46 SSE amp MINI GW uni SAMSUNG MCU gang programmer 10 Adapter Socket Table SAMSUNG SAM4 S3P7XXX series adapter socket table Device Name Package type Socket type Adapter socket 428DIP UA7048 42SDIP S3P7048 Me UA7048 44QFP 44QFP 30SDIP UAS 30SDIP S3P70F4 3250P Standard type UAS 32SOP S3P7235 80QFP Standard type UAS 80QFP S38P72H8 64QFP Standard type UAS 64QFP 53P72K8 80QFP Standard type UAS 80QFP S38P72M9 128QFP Standard type UAS 128QFP S3P72N5 80QFP Standard type UAS 80QFP S3P72P9 100QFP Standard type UAS 100QFP S38P72Q5 100QFP Standard type UAS 100QFP S3P7324 64QFP Standard type UAS 64QFP S3P7335 80QFP Standard type UAS 80QFP 42SDIP UAS 42SDIP 44QFP UAS 44QFP 645D UA7515 64SDIP S3P7515 64QF Special type UA7515 64QFP 425D UAS 42SDIP 44QF UAS 44QFP D P 24SDIP SEE UA7544 248DIP 24SOP UA7544 2480P 64SDIP UAT515 648DIP aiias 64QFP ape UA7515 64QFP S3P7414 Standard type S3P7528 Standard type S3P7544 S3P7565 100QFP Standard type UAS 100QFP 47 SSE amp MINI GW uni SAMSUNG MCU gang programmer SAMSUNG SAM8 S3P8XXXX S3F8XXX series adapter socket table Device Name Package type Socket type Adapter socket 80QFP UAS 80QFP S3F8285 80TQFP Standard type UAS 80TQFP 80QFP UAS 80QFP S3F8289 80TQFP Standard type UAS 80TQFP 80QFP UAS 80QFP S3F828B Standa
16. process 1 Write UPGRD to the Start Address blank and then enter the Enter key Qo ASAS GW uni Eile Execution Program Option Help Device Samsung MCU S3F8419 ver sov E o dc We ii j 5g GW uni is connected Data Information Program Count Start Address UPGRD Success Num 001579 IGW Uni FirmWare Upgrade End Address Fail Num 000461 Download Upgrade Data FT Download Success GE EKS Clear Count KEETE ER RARR ERR ERERER RE RAR EER RER GW uni is disconnected GW uni Setting Information Operation Option Key Lock Password Change Start Address 00000000 Program Option End Address 00001E9F IV Auto Chip Erase p IV Auto Verification Checksum CB99 F Auto Blank Checking m IV Auto Read Protection vDD V 5 0 F Auto LDC Protection F Auto Hard Lock VPP 5 0 iV SMART Option Device S3F8419 Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Disconnected Figure 3 23 Upgrade Start 2 The upgrade data is downloaded when user enters Enter key 3 GW uni is upgraded after finish the download 4 Restart GW uni about 20 min later Power off gt Power On 28 SSE amp MINI GW uni SAMSUNG MCU gang programmer 4 Stand alone mode 4 1 System on and initialization To use GW uni with stand alone mode user should setup PC application program and download a data first T
17. 000 L Writing Program Option Verification End Address 00007FFF IV Auto Chip Erase complete V Auto Verification Checksum C000 Auto Blank Checking F Auto Read Protection VoD 5 0 F Auto LDC Protection m F Auto Hard Lock VEE 5 0 I SMART Option Connected Figure 3 11 Verify 16 SSEMINI GW uni SAMSUNG MCU gang programmer 3 12 Chip erase Delete a device ROM data 5 test 01 FF _32K bin GW uni Eile Execution Program Option Help Device Samsung MCU S3F8419 x von 5 0v ver sov sA sste mM BG S R Boo ag DalErase devices ________ Program Count Buffer Checksum Start Address 00000000 Success Num 000002 C000 End Address 00007FFF Fail Num 000014 Read Buffer Memory Completed Checksum cono Clear Count C WProjectsWToolHiGW JE UniversalttDebuglismxtiseminix GW uni Setting Information Operation Option hex UC saag Key Lock PROGRAM Password Change Erase StartAddress 00000000 Block Check Program Option Writing End Address 00007FFF iv Auto Chip Erase Verification IV Auto Verification complete Checksum C000 V Auto Blank Checking E F Auto Read Protection Chip Ease VDD 5 0 I Auto LDC Protection complete F Auto Hard Lock VEE 5 0 SMART Option Socket State DONE DONE DONE DONE DONE DONE DONE DONE Erase Connected Fi
18. AS 32S0P UAS 32SDIP UAS 20SD S3F94A5 44QF 428D Standard UAS 44QF UAS 42S8D 53P9688 P P P P 428D 44QFP Standard 50 P P P UAS 42SDIP UVAS 44QFP semmn lt GW uni SAMSUNG CalmRISC8 CalmRISC16 S3FKXXXX S3FCXXX series adapter socket table Device Name Package type SAMSUNG MCU gang programmer Socket type Adapter socket SQFKTTF 128QFP Standard type UAS 128QFP SQFK215 80QFP Standard type UAS 80QFP SQFK225 64QFP 64LQFP Standard type UAS 64QFP UAS 64LQFP S3FK318 44QFP Standard type UAS 44QFP S38FC11B 100QFP 100TQFP Standard type UAS 100QFP UAS 100TQFP S38FC34D 100QFP 100TQFP Standard type UAS 100QFP UAS 100TQFP S38FC40D 100QFP 100TQFP Standard type SAMSUNG On board Chip COB type adapter cable Device Name Package type Socket type UAS 100QFP UAS 100TQFP Adapter cable On board programing Samsung Standard UAS Pellet COB Chip On Board Pellet Die form 451 UAS Pellet SSE amp MINI
19. Cm test 01 FF _32K bin GW uni File Execution Program Option Help Device Samsung MCU S3F84I9 BA 6 we wW Device Checksum C000 Buffer Checksum C000 Read Buffer Memory Completed C WProjectsWToolHGW UniversalliDebuglismxtiseminix hex PROGRAM Erase Block Check Writing Verification complete Socket State vob 5 0v ver 5 0v z Sh BO amp ObadT Data Information StartAddress 00000000 End Address 00007FFF Checksum cooo GW uni Setting Information SSFBdS Start Address 00000000 End Address 00007FFF cam 4 Program Count Success Num 000002 FailNum 000014 D Clearcoat Operation Option Key Lock Password Change Program Option IV Auto Chip Erase IV Auto Verification IV Auto Blank Checking F Auto Read Protection F Auto LDC Protection F Auto Hard Lock IV SMART Option Device Checksum VDDIV VPP V success FAIL FAL Figure 3 21 FAIL Connected State Window 26 SSEMINI GW uni SAMSUNG MCU gang programmer 3 22 GW uni Setting window Display GW uni setting state Om test 01 FF _32K bin GW uni Eile Execution Program Option Help Device Samsung MCU S3P7048 yoo sov EL wWw ESO m amp vomvoeualu GW uni is connected Data Information Program Count Start Address 00000000 Success Num 000000 Open HEX File C WProjectsWTest file
20. DAR Device Samsung MCU S3F8419 v voo s ov E epr D c9 D d p fo amp LU GW uni is connected Data Information Start Address 00000000 Open HEX File C HProjectstiTest filetest End Address 00007FFF 01 FF 32K bin Checksum co GW uni Setting Information Device S3F84l9 Start Address 00000000 End Address 00007FFF Checksum cooo VDD V 50 VPP 50 Socket State x ver 5 0v gt Program Count Success Num 000000 Fail Num 000000 Operation Option Key Lock Password Change Program Option IV Auto Chip Erase IV Auto Verification IV Auto Blank Checking Auto Read Protection F Auto LDC Protection F Auto Hard Lock iv SMART Option SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 Ready SOCKET 8 Connected Figure 3 9 2 Download Success 15 SSEMINI GW uni SAMSUNG MCU gang programmer 3 10 Program 1 Write a data from GW uni buffer memory to a device 2 Execute selected program options in order 3 Display the program result of each socket in Socket state windows 4 Program count is renewed 5 test 01 FF _32K bin GW uni Eile Execution Program Option Help Device Samsung MCU S3F8419 100 s 0v ver 5 0v gt Program the buffer Memory to devices GW uni is connected Data Tntormation rProgram Co
21. End Address 00007FFF IV Auto Chip Erase IV Auto Verification Read Buffer Memory Checksum C000 Iv Auto Blank Checking CoMProjectsToolGW vDDM mA 1 0 k 5 i UniversalttDebugttsmxttseminixd e an aia Lh z ex VEE 5 0 I SMART Option Socket State SUCCESS FAIL FAIL Connected Figure 3 17 3 Complete Read Buffer 3 18 Key Lock If the Key Lock Selected the following function will be protected PC Application Program Device Selection Download Program Option Dump function Stand alone mode Device Setting Program Option and Read Device function 1 Click the Key Lock check box and Key Lock setting window is displayed 5 test 01 FF _32K bin GW uni File Execution Program Option Help Device Samsung MCU S3F8419 yoo sov ver sov Biche W GARR ttu au GW uni is connected Data Information Program Count Start Address 00000000 Success Num 000000 Open HEX File c C WProjectsWTest fileitest End Address 00007FFF Fail Num 000000 01 FF 32K bin Checksum cooo QlerCoumt Download Success GW uni Setting Information Operation Option 1 Device S3FB4I9 Rey Ent Password Change Program Option End Address 00007FFF IV Auto Chip Erase t M IV Auto Verification Checksum C000 IV Auto Blank Checking F Auto Read Protection VDDM 5 0 Auto LDC Protection m F Auto Hard Lock VPP 5 0 f SMART Optio
22. F8418 Standard 80TQFP UAS 80TQFP S3F84MB 80QFP Standard type UAS 80QFP 8SOP UAS 8SOP S3F84P4 de Standard type UAS 8DIP S3P851B 160QFP Standard type UAS 160QFP S3P852B 100QFP Standard type UAS 100QFP 42SDIP Standard type UAS 42SDIP DERES 44QFP Special type UA8629 44QFP S3F8647 325D Standard type UAS 328DIP 42SD UAS 42SDIP S3F866B AAQF Standard type UAS 44QFP S3F880A 425D Standard type UA8837 42SDIP 53P8849 425D Standard type UAS 42SDIP 49 SSE amp MINI GW uni SAMSUNG MCU gang programmer SAMSUNG SAM8 S3P9XXXX S3F9XXX series adapter socket table Device Name Package type Socket type Adapter socket S3P9228 42SDIP 44QFP Standard type UAS 42SDIP UVAS 44QFP S3P9234 64QFP Standard type UAS 64QFP S3P9404 30SDIP 3250P Standard type UAS 30SDIP UAS 3280 53P9428 28S50P 3250P 30SDIP Standard UAS 2880 UAS 3280 UAS 30SDIP S3P9434 18DIP 20DIP 20SOP Standard UAS 18DIP UAS 20DIP UAS 208O0P S38P9444 850P 8DIP Standard UAS 8SOP UAS 8DIP S3P9454 16DIP 16SOP 16TSSOP 20DIP 20SOP 20SSOP Standard UAS 16DIP UAS 16SOP UAS 16TSSOP UAS 20DIP UAS 20S0P UAS 208S0P 53P9488 32SDIP 32SOP 42SDIP 44QFP Standard UAS 328DIP UAS 32S0P UAS 42SDIP UVAS 44QFP 53P9498 28SOP 3250P 32SDIP 20SD Standard UAS 28S50P U
23. INIX Co Ltd Seminix Co Ltd 2ndFl EGTel Building 835 8 Yoksam Dong Kangnam Gu Seoul Korea 135 080 Web Address http www seminix com E mail sales seminix com Tel 82 2 539 7891 Fax 82 2 539 7819 Table of Contents 1 Overview 1 1 Features and Specifications 1 1 2 Packing Includes 2 2 Setup 2 1 Host system requirement 3 2 2 To install PC application program 3 2 3 To install USB driver 3 2 4 GW uni Configuration 3 3 PC Application Program 3 1 3 2 3 3 3 4 3 5 3 6 3 7 3 8 3 9 3 10 3 11 3 12 3 13 3 14 3 15 3 16 3 17 3 18 3 19 3 20 3 21 3 22 3 23 PC application program 4 Hardware setup 4 USB connection 5 Device selection 6 File Open 8 Program Option gt 10 System Power VDD Program Power
24. MINI GW uni SAMSUNG MCU gang programmer 3 4 Device selection 1 Click the Device icon Cm HELE GW uni Eile Execution Program Option Help 3 w a BeSsecrdewces ge MW E D d p p amp OD GW uni is connected Data Information Program Count Start Address Success Num 000000 End Address Fail Num 000000 Checksum Clear Count GW uni Setting Information Operation Option Device NOTHING Bis Password Change StartAddress 00000000 Program Option End Address 00000000 iv Auto Chip Erase F Auto Verification Checksum 0000 Auto Blank Checking Auto Read Protection vDD V 33 F Auto LDC Protection F Auto Hard Lock NEED 33 SMART Option Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Select Device Connected Figure 3 4 1 Device selection 2 Select Device Window is displayed C HSYS GW uni s voof ot ww AARRh hag Select Device Manufacturer Device Product Number Samsung Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Ready Connected Figure 3 4 2 Select Device Window 6 SEMINIX GW uni SAMSUNG MCU gang programmer 3 Select a manufacturer a device and a product number GASS GN uni s ve ae Re M Select Device Manu
25. Revision 1 1 Users Manual GW uni SAMSUNG MCU gang programmer SSESMINI WWW SEMINIX COM Important Notice The information in this publication has been carefully checked and believed to be entirely accurate at the time of publication SEMINIX assumes no responsibility however for possible errors or omissions or for any consequences resulting from the use of the information contained herein SEMINIX continues to improve products and upgrade specification and firmware at any time without notice SEMINIX reserves the right to make changes in its products or product specifications with the intent to improve function or design at any time and without notice and is not required to update this documentation to reflect such changes SEMINIX makes no warranty representation or guarantee regarding the suitability of its products for any particular purpose nor does SEMINIX assume any reliability arising out of the application or use of any product or circuit and specifically disclaims any and all liability including without limitation any consequential or incidental damages 2008 SEMINIX Co Ltd This publication contains proprietary information which is protected by copyrights All rights are reserved No part of this publication may be photocopied reproduced transmitted in any form or translated to another language by means electric or mechanical by photocopying recording or otherwise without the prior written consent of SEM
26. VPP 12 Program count gt 13 Data download 15 PIOglan as 16 Verify eee nn e 16 Chip erase 17 Blank check 17 Device Checksun 18 Buffer checkSUM 18 Dump 19 Read Buffer 20 Key LOCK 21 Password Change 24 Socket state DD 26 State Window 27 GW uni Setting window 27 Upgrade a a an Ane 28 4 Stand alone mode 4 1 System on and initialization 29 4 2 LCD display information 29 4 3 Program mode
27. ation Program Connect USB cable Select Device File Open Select Program Option Download Data PC Operation Stand alone Operation Disconnect USB Program Verify Erase Program Verify Erase Figure 5 1 Operation Sequence 41 SSE amp MINI GW uni SAMSUNG MCU gang programmer 6 Key Function map GW uni Power ON Initial System RIGHT RIGHT ED BUF Checksum BE Program em Verification LEFT RIGHT LEFT l RIGHT RIGHT RIGHT DVC Checksum m Blank Check ER Erase MENU Menu UP f MENU Execute Device Settin i 9 Device Checksum UP l DOWN MENU Execute Program Option Buffer Checksum UP l DOWN MENU Execute Read Device Read Device UP l DOWN MENU Display Program Count Program Count UP l DOWN MENU Beep Sound Beep Sound On Off UP l DOWN Information kanin Display Information UP l DOWN Retum MENU Return to Last Mode DOWN Figure 6 1 Key Function Map Please make sure that USB cable should not be connected when user want to use the stand alone mode because Key is not working whe
28. d address and checksum t can take a little time for checksum depending on a file size Om test 01 FF _32K bin GW uni File Execution Program Option Help Device Samsung MCU S3F8419 x vo sov T ver 5 0v EJ E X dc xw Ww E D I ttulu GW uni is connected Data Information Program Count Start Address 00000000 Success Num 000000 Open HEX File C WProjectstiTest filetttest End Address 00007FFF Fail Num 000000 01 FF 32K bin Checksum cooo QlarCoumt GW uni Setting Information Operation Option Device 53F8419 Keyta Password Change Program Option End Address 00000000 IV Auto Chip Erase pa F Auto Verification Checksum 0000 Auto Blank Checking F Auto Read Protection VDD V 5 0 I Auto LDC Protection m F Auto Hard Lock VPP 5 0 SMART Option StartAddress 00000000 Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Ready Connected Figure 3 5 3 Finish the file selection 9 SSEMINI GW uni SAMSUNG MCU gang programmer 3 6 Program option 1 Select program option 1 Auto Chip Erase 2 Auto Verification 3 Auto Blank Checking Check a device ROM data initialized OxFF 4 Auto Read Protection Device ROM data is read as 0 5 Auto LDC Load Code Protection Programmed code in a device isn t read in user program mode 6 Auto HardLock Can t program in
29. ected device Cm test 01 FF _32K bin GW uni File Execution Program Option Help ENSE Device Samsung MCU S3P7048 c voo sov amp amp c ww m EEE GW uni is connected Data Information Program Count StartAddress 00000000 Success Num 000000 Open HEX File pa C 4Projects Test filetitest End Address 00007FFF Fail Num 000000 017FF 32K bin Checksum cooo ClarCont GW uni Setting Information Operation Option Device S3P7048 bey lack Password Change p Start Address 00000000 End Address 00000000 Auto Verification Auto Blank Checking Auto Read Protection AEG 5 0 Auto LDC Protection vePM 12 5 Sanoin Checksum 0000 Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Ready Connected Figure 3 6 2 Program Option unavailable Option se SSEMINI GW uni 3 7 System Power VDD Program Power VPP 1 VDD System power setting User can set 3 3V or 5 0V Cm test 01 FF 32K bin Eile Execution Program Option Help GW uni SAMSUNG MCU gang programmer Device Samsung MCU S3F8419 BE X re HH En B mute GW uni is connected Open HEX File C WProjectsHTest filelitest 01 FF 32K bin Socket State Data Information Start Address End Address Checksum 00000000 00007FFF Tam GW uni Setting Inf
30. en device Device Name S3P7048 S3P70F4 S3P7235 Figure 4 10 Device Setting Display a chosen device with an inverted color A device can be changed by UP and DOWN key Touch the MENU key to select a chosen menu Touch the PROGRAM key for a previous mode 1 2 3 4 gt wa This device setting can t used if there is the Key lock setting 4 11 Program Option Change a program option Device Name Verification Blank Check ReadProtection Figure 4 11 Program Option 1 Display an icon when an option is chosen 2 An option can be changed by UP and DOWN key 3 Touch the MENU key to select a chosen option 4 Touch the PROGRAM key for a previous mode 5 Back to a menu mode when Return is selected This program option can t be used if there is the Key lock setting 37 SSE amp MINI GW uni SAMSUNG MCU gang programmer 4 12 Read Device Read a device ROM data in the socket 1 and save it to GW uni buffer memory 1 Display a device setting menu when Read Device is selected Device Name S3P7048 S3P70F4 S3P7235 Figure 4 12 1 Device selection 2 Display a confirmation window when a device is selected Read Device Device Name Continue NO YES Figure 4 12 2 Read Device confirmation 3 Back to a menu mode when NO is selected 4 Execute Read Device when YES is selected lt Read Device gt E A OxXXXXXXXX C A OxXXXXXXXX
31. facturer Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Ready Connected Figure 3 4 3 Device selection 4 A device information is showed when click the OK icon Gu ETE GW uni Eile Execution Program Option Help Device Samsung MCU S3F84I9 GW uni is connected Data Information Program Count Start Address Success Num 000000 End Address Fail Num 000000 Checksum Clear Count GW uni Setting Information Operation Option F Key Lock Password Change Start Address 00000000 IS Program Option End Address 00000000 IV Auto Chip Erase ER F Auto Verification Checksum 0000 F Auto Blank Checking F Auto Read Protection VDDIV 5 0 F Auto LDC Protection F Auto Hard Lock VERW 5 0 I SMART Option Device S3F8419 Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Ready Connected 4 Figure 3 4 4 Display a device information 7 SSEMINI GW uni SAMSUNG MCU gang programmer 3 5 File open 1 Click the file open icon Em HSS GW uni File Execution Program Option Help Device Samsung MCU S3F8419 voo 5 ov x ver 5 0v S888 t t amp GW uni is connected Data Information Program Count Start Address Success Num 000000 End Addres
32. gure 3 12 Erase 3 13 Blank check Check a device ROM data initialized OxFF Cm test 01 FF _32K bin GW uni Eile Execution Program Option Help Device Samsung MCU S3F8419 c voo sov E oa c We GW uni is connected Data Inf Check if devices are blank data FF m Count Start Address 00000000 Success Num 000000 Open HEX File z C WProjectsHiTest filetttest End Address 00007FFF Fail Num 000000 017FF 32K bin Checksum C000 Clear Count Download Success GW uni Setting Information Operation Option P Blank Check Device S3F849 Key Lock cumpletet Password Change Start Address 00000000 Program Option End Address 00007FFF IV Auto Chip Erase F Auto Verification Checksum C000 F Auto Blank Checking F Auto Read Protection VDDM 5 0 F Auto LDC Protection F Auto Hard Lock VERW 5 0 SMART Option Socket State SUCCESS FAIL FAIL FAIL FAIL FAIL FAIL FAIL Connected Figure 3 13 Blank Check Si SEMINIX GW uni SAMSUNG MCU gang programmer 3 14 Device checksum Display a device checksum in the 1 Master socket of 8 sockets test 01 FF _32K bin GW uni Eile Execution Program Option Help Device Samsung MCU S3F84I8 Open HEX File Data Inform Get checksum from devices gram Count C WProjectsWTest filetttest Start Address 00000000 Success Num 000001 01 FF 32K bin I i He End Addres
33. gure 7 3 Connect UAS Pellet Adapter cable to the User Board 3 Put a UAS Pellet adapter cable in GW uni 7 3 Caution 1 2m of cable is the maximum length from UAS Pellet socket to 20CB6 Adapter Board 2 20cm of cable is the maximum length from Adapter Board to Target MCU 3 if you program to MCU on board you must use the UAS Pellet Adapter Cable 4 Please check components Rsdat Rclk Rrst Cvpp Cvdd 45 SSEMINI GW uni SAMSUNG MCU gang programmer 8 Electrical Characteristics Parameter Conditions Min Typ Max Unit Stand By 130 150 Current Consumption mA Operating 300 VDD VPP 3 3 12 5 3 3 5 0 V VPP VDD 3 3 or 5 0 3 3 12 5 V VPP 3 3V 500 mA VDD 3 3V idd VPP 12 5V 500 mA VPP 5 0V 500 mA VDD 5 0V VPP 12 5V 500 mA VPP 3 3V 25 mA VDD 3 3V VPP 12 5V 25 mA Pp VPP 5 0V 25 mA VDD 5 0V VPP 12 5V 25 mA 9 Special Notice 1 Please make sure to check device information End address Vdd Vpp buffer check sum before programming 2 Please check device checksum regularly for normal programming 3 Please check Vdd and Vpp regularly 4 Please contact SEMINIX when there is a problem of device programming 5 GW uni is the socket programmer only so SEMINIX can t take the responsibility for all accidents after user s artificial manipulation without SEMINIX socket 6 SEMINIX doesn t take the responsibility
34. heck Lad Key Lock Writing Verification e Password Change complete Clear Count gram Option Chip Erase Auto Chip Erase complete Auto Verification Auto Blank Checking Blank Check f Auto Read Protection complete I Auto LDC Protection F Auto Hard Lock VEPM V SMART Option r Socket State SUCCESS FAIL FAIL FAIL FAIL FAL FAIL FAIL Connected Figure 3 8 3 Success message 6 Success Num and Fail Num is initialized to 0 after the Clear Count process is normally finished 5 test 01 FF _32K bin GW uni File Execution Program Option Help Device Samsung MCU S3F8419 C yoo 5 0v E 9 5 xw M BSRABhaG GW uni is connected Data Information Program Count Start Address 00000000 Success Num 000000 Open HEX File m C WProjectsWTest filetitest End Address 00007FFF Fail Num 000000 01 FF 32Kbin Checksum conn Clear Count PROGRAM Erase GW uni Setting Information Operation Option Block Check Key Lock Writing Device S3F8419 Verification Password Change Program Option Chip Erase End Address 00007FFF IV Auto Chip Erase complete IV Auto Verification Checksum cono IV Auto Blank Checking Blank Check F Auto Read Protection complete VDD V 5 0 Auto LDC Protection F Auto Hard Lock VEE 5 0 f SMART Option complete Start Address 00000000 Socket State SUCCESS FAIL
35. is function refer to 3 19 Password Change 28 SSEMINI GW uni SAMSUNG MCU gang programmer 3 19 Password Change Change password 1 Click the Password Change button and the Password setting window is displayed 5 test 01 FF _32K bin GW uni Eile Execution Program Option Help B Device Samsung MCU S3F8419 voo s v E amp c xw Hi c D L t m au GW uni is connected Data Information Program Count Start Address 00000000 Success Num 000000 Open HEX File C 4Projects Test filetitest End Address 00007FFF Fail Num 000000 01 FF 32K bin Checksum cooo Clear Count Download Success GW uni Setting Information Operation Option Device S3F8419 Password Change StartAddress 00000000 Program Option End Address 00007FFF IV Auto Chip Erase IV Auto Verification Checksum cooo Auto Blank Checking F Auto Read Protection VDD 5 0 Auto LDC Protection F Auto Hard Lock VPP 5 0 V SMART Option Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Ready Connected Figure 3 19 1 Password Change execution 2 Input a previous password in Password blank box and input a new password in New Password blank box and click Change button to change the password Gytest 01 FF 32K bin GW uni BE Device Samsung MCU S3F8419 voo s ov v ver sov E LEIE w MH D H
36. iting Verification complete I Verify complete Device Checksum C000 Buffer Checksum C000 Socket State Data Information StartAddress 00000000 End Address 00007FFF Checksum cooo Check Password Check Password Password VPP V zi Program Count Success Num 000001 Fail Num 000007 1 L jEration Option Key Lock Password Change Auto Chip Erase Auto Verification Auto Blank Checking F Auto Read Protection F Auto LDC Protection F Auto Hard Lock iv SMART Option SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 Ready SOCKET 6 SOCKET 7 20 SOCKET 8 Connected Figure 3 17 2 Input password SSEMINI GW uni SAMSUNG MCU gang programmer 3 File address is displayed after Read Buffer is completed Om test 01 FF _32K bin GW uni File Execution Program Option Help PES p Device Samsung MCU 53F8419 VOD 5 0v E uw ow HM E D d D p amp u Erase Data Information Program Count 7 Block Check Start Address 00000000 Success Num 000002 Writing PA Verificati End Address 00007FFF Fail Num 000014 complete Checksum cooo Clear Count Verify complete GW uni Setting Information Operation Option ie Device S3F8419 I Key lack Device Checksum C000 Password Change StartAddress 00000000 Buffer Checksum 7 Program Option C000
37. lelitest 017FF 32K bin Download Key Lock Success Data Information d El E VPP s v Program Count Success Num 000000 Fail Num 000000 Clear Count Key Lock Password vDDM Socket State Auto Chip Erase Auto Verification Auto Blank Checking I Auto Read Protection F Auto LDC Protection F Auto Hard Lock IV SMART Option SOCKET 1 SOCKET 5 SOCKET 6 Ready SOCKET 2 SOCKET 3 SOCKET 7 SOCKET 4 SOCKET 8 Connected Figure 3 18 3 Key Unlock 22 SEMINI x GW uni SAMSUNG MCU gang programmer Cn X3ES8lS GW uni Fil 7 neues wer ETTE VRESRAMHRaAQ GW uni is connected Data Information Firmware Version 1 04 Program Count Start Address Success Num 000000 End Address Fail Num 000000 Checksum Clear Count i i Onesetion Option GW uni Eal Lock issword Change Key Locked If you use this function you must disable Key Lock Option Chip Erase Verification Auto Blank Checking Auto Read Protection VDD V I Auto LDC Protection F Auto Hard Lock VEE s SMART Option Checksum Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Ready Connected Figure 3 18 4 Key lock mode Device Selection Error This function helps to avoid an operator s mistake in the mass production line You must set Password before use th
38. n Start Address 00000000 Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Ready Connected Figure 3 18 1 Key Lock execution 2 SEMINIX GW uni SAMSUNG MCU gang programmer 2 Input password and click Lock or Unlock button 3 Lock Set the key lock 4 Unlock Set the key unlock 5 Exit Ctest 0I FF 32K bin GW uni Device Samsung MCU S3F84I9 R voo 5 ov s oe tt EO d t cC a Download Success Socket State GW uni is connected Open HEX File C WProjectsWTest filelitest 017FF 32K bin Data Information Start Address 00000000 End Address 00007FFF Checksum cooo Program Count Success Num 000000 Fail Num 000000 Clear Count Key Lock eration Option Key Lock Password Password Change bgram Option Auto Chip Erase f Auto Verification f Auto Blank Checking F Auto Read Protection F Auto LDC Protection F Auto Hard Lock IV SMART Option SOCKET 1 SOCKET 5 Ready SOCKET 3 SOCKET 4 SOCKET 8 Connected SOCKET 2 SOCKET 6 SOCKET 7 Figure 3 18 2 Key Lock Cotest 0I FF 32K bin GW uni Device Samsung MCU S3F8419 e von sov B X doge DM GW uni is connected Start Address 00000000 End Address 00007FFF Checksum cooo Open HEX File C WProjectsWTest fi
39. n USB cable is connected 42 SSE amp MINI GW uni SAMSUNG MCU gang programmer 7 On Board Program 7 1 UAS Pellet Adapter Cable You must use a UAS Pellet Adapter Cable when you use GW uni to program MCU or COB on the PCB Je 20CB6 Connection Cable UAS Pellet Adapter Figure 7 1 Component of UAS pellet Adapter Cable 43 SSEMINI GW uni SAMSUNG MCU gang programmer 7 2 Connection 1 20CB6 Adapter Board GND Target MCU GND Vss 2 20CB6 Adapter Board VOD Target MCU Vdd Vcc 3 20CB6 Adapter Board RST Target MCU Reset 4 20CB6 Adapter Board VPP Target MCU Vpp Test if Reset pin and Vpp Test pin are same you have only to connect Vpp Test pin 5 20CB6 Adapter Board SCLK Target MCU SCLK 6 20CB6 Adapter Board SDAT Target MCU SDATA Rsdat OE PE SDAT ER To Application Circuit SCLK To Application Circuit NS a Tadepiicatlan Ciresit 0 plication rcu MCU Cvdd Cvpp 20CB6 Adapter board component of UAS Pellet Adapter Cable Figure 7 2 Connect UAS Pellet Adapter Cable to MCU Rsdat 4 7K ohm Rclk 4 7K ohm Rrst 1K 4 7K ohm Cvpp 10nF Cvdd 10nF 44 SSEMINI GW uni SAMSUNG MCU gang programmer 2 Connect UAS Pellet Adapter to 20CB6 Adapter Board via connect cable User Board UAS Pellet 20Cm max gt EAM JP202 2 54mm pitch Hole JP203 2mm pitch Hole Fi
40. ocket State Display each socket state 23 User can use the latest software with a simple upgrade 24 Data download speed 860Kbps 25 Program speed average OTP 2Kbps MTP 10Kbps 26 Power 19VDC 500mA power adapter 110 220VAC 60HZ 27 Operating system Windows NT 2000 XP 28 Support Intel hex format SAMSUNG hex format Binary format 29 Size 350mm x 220mm x 35mm Weight 1 4kg 1 2 Packing Includes 1 GW uni main body 2 USB Cable 3 Power adapter 19VDC 4 PC Application program CD 5 6 User s manual CD USB Driver file CD GW uni main body PC Application program USB Driver file 7 S User s Manual Power Adapter and Cable USB Cable 2 SS amp MINI GW uni SAMSUNG MCU gang programmer 2 Setup 2 1 Host system requirement 1 Over IBM Pentium PC 2 Window 2000 XP NT OS 3 CD ROM USB port 4 Operating System with 20MB of free Hard disk space 5 Over RAM 64MB wae wa 2 2 2 To install PC application program 1 Insert the installation CD into CD ROM drive on your PC or download software at SEMINIX web site www seminix com 2 Execute the setup file in CD 3 Install PC application program in order according to the instruction 4 The program is installed at the folder C Program Files seminix GW uni when the installation is finished 2 3 To install USB driver 1 After restarting a host PC connect GW uni to USB port of the host PC Then the PC displays
41. ode 32 SSE amp MINI GW uni SAMSUNG MCU gang programmer 4 6 Blank Check mode Check a device ROM data initialized Oxff RES BLANK CHECK Device S3F9454 Vdd 5 0 Vpp 12 5 Figure 4 6 1 Blank check mode 1 Touch the PROGRAM key for Blank Check RE Device S3F9454 lt Blank Check gt Figure 4 6 2 Blank check mode Blank check 2 Touch the RIGHT key for DVC Checksum mode 3 Touch the LEFT key for Erase mode 4 Touch the MENU key for Menu mode 33 semmnm lt GW uni SAMSUNG MCU gang programmer 4 7 Device Checksum mode Get a device checksum in the first socket Master of 8 sockets RE DVC CHECKSUM Device S3F9454 Vdd 5 0 Vpp 12 5 Figure 4 7 1 Device checksum mode 1 Touch the PROGRAM key for device checksum lt Checksum gt E A OxXXXXXXXX C A OxXXXXXXXX Figure 4 7 2 Device Checksum Loading lt Device Checksum gt Device S3F9454 E A OxXXXXXXXX CheckSum OxXXXX Figure 4 7 3 Device Checksum Done 2 Touch the RIGHT key for BUF Checksum mode 3 Touch the LEFT key for Blank Check mode 4 Touch the MENU key for Menu mode E A End Address C A Current Address Checksum 2byte 34 semmn lt GW uni SAMSUNG MCU gang programmer 4 8 Buffer Checksum Display a checksum of GW uni buffer memory ES DVC CHECKSUM Device S3F9454 Vdd 5 0 Vpp 12 5 Figure
42. ormation Device Start Address End Address Checksum VDD V VPP S3F8419 00000000 00000000 0000 5 0 5 0 Program Count Success Num 000000 Fail Num 000000 Operation Option KeyLock Password Change Program Option Auto Chip Erase Auto Verification Auto Blank Checking Auto Read Protection Auto LDC Protection Auto Hard Lock SMART Option SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 Ready SOCKET 6 SOCKET 7 SOCKET 8 Connected Figure 3 7 1 VDD setting 2 VPP Program power setting User can set VPP from 3 3V to 12 5V in the unit of 0 1V test 01 FF _32K bin GW uni Eile Execution Program Option Help Device Samsung MCU S3F84I8 amp Ao dc w m C oo sov GW uni is connected Open HEX File C WProjectsWTest filelitest 01 FF 32K bin Socket State E B EL v bag Data Information Start Address End Address Checksum 00000000 00007FFF am GW uni Setting Information Device Start Address End Address Checksum VDD V VPP S3F8419 00000000 00000000 n s Fail Num 000000 Operation Option Key Lock Password Change Program Option Auto Chip Erase Auto Verification Auto Blank Checking Auto Read Protection Auto LDC Protection Auto Hard Lock SMART Option SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5
43. ouch keys don t work if the USB cable is connected so please disconnect USB cable for the stand alone mode 1 Set a device with reference to 3 4 Device selection 2 Set a program option with reference to 3 6 Program Option 3 Download a data with reference to 3 5 File Open 3 9 Data Download 4 5 The system information is kept until user set it again Disconnect USB cable The key is not working when USB cable is connected 4 2 LCD display information There is a program standing mode when user turns on GW uni power after initialization Fed El laic eS Program Option PROGRAM Current Mode Device S3F9454 Device Name Vdd 5 0 Vpp 12 5 Device Information Figure 4 2 LCD display 1 Program Option Display Program option 1 E amp Auto Chip Erase 2 ED Auto Verification 3 L Auto Blankcheck 4 B3 Auto Read Protection 5 amp Auto LDC Protection 6 EB Auto Hard Lock 7 SMART Option 2 Current Mode Display a current mode 1 PROGRAM VERIFICATION ERASE BLANK CHECK DVC CHECKSUM and BUF CHECKSUM 2 A mode is changed in order when touch LEFT and RIGHT keys 29 SSE amp MINI GW uni SAMSUNG MCU gang programmer 3 Device Name Display a device name Display Nothing when there is not any selected device 4 Device Information Display Device setting information 1 Vdd System Power Voltage 2 Vpp Program Power Voltage 3
44. rd type UAS 80TQFP 80TQFP 44QFP UAS 44QFP S3F82E5 ABTQFP Standard type UAS 48TQFP 100QFP UAS 100QFP uc 100TQFP eg UAS 100TQFP S3P830A 100QFP Standard type UAS 100QFP 100QFP UAS 100QFP Pune 100TQFP ende le UAS 100TQFP 80QFP UAS 80QFP S3P8325 80TQFP Standard type UAS 80TQFP S3F833B 100QFP Standard type UAS 100QFP S3F834B 100TQFP Standard type UAS 100TQFP 80QFP UAS 80QFP S3P8454 80TQFP Standard type UAS 80TQFP 64SDIP UAS 64SDIP S3P8469 64QFP Standard type UAS 64QFP 42SDIP UAS 42SDIP S3P8475 AAQFP Standard type UAS 44QFP 64SDIP UAS 64SDIP S3P848A 64QFP Standard type UAS 64QFP S3P84A4 64QFP Standard type UAS 64QFP 80TQFP Special type UA84BB 80TQFP 80QFP Standard type UAS 80QFP 100TQFP Special type UA84DB 100TQFP 100QFP Standard type UAS 100QFP 42SDIP UAS 42SDIP S3P84E9 AAQFP Standard type UAS 44QFP S3F84BB S3F84D8 48 SSE amp MINI GW uni SAMSUNG MCU gang programmer SAMSUNG SAM8 S3P8XXXX S3F8XXX series adapter socket table Device Name Package type Socket type Adapter socket 32SDIP UAS 32SD 3250P UAS 3280 30SDIP UAS S80SD P P P UAS 2880 S3F84H5 Standard type 2880 42SD 44QF UAS 428D UAS 44QF 42SDIP UAS 42SDIP S3F8419 44QFP Standard UAS 44QFP 16DIP UAS 16DIP 16SOP UAS 16SOP 16SSOP UAS 16SSOP S3F84K4 16TSSOP Standard UAS 16TSSOP 20DIP UAS 20DIP 20SOP UAS 20SOP 20SSOP UAS 20880P S3
45. s 00007FFF Fail Num 000007 a Checksum cooo Clear Count PROGRAM GW uni Setting Information Operation Option Erase See c r Block Check Device S3F84I9 Key Lock Writing a Password Change Verification StartAddress 00000000 complete Program Option End Address 00007FFF IV Auto Chip Erase Verify IV Auto Verification complete Checksum C000 IV Auto Blank Checking F Auto Read Protection E vene Sil F Auto LDC Protection F Auto Hard Lock VPP 5 V SMART Option Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Device Checksum Connected Figure 3 14 Device Checksum 3 15 Buffer checksum Display a checksum of GW uni internal memory data Cm test 01 FF _32K bin GW uni Eile Execution Program Option Help Device Samsung MCU S3F8419 x woo sov x ver 5 0v I E A Base W53umuev vaeu Data Information l st checksum from the buffer memory Download Start Address 00000000 Success Num 000001 Success pM End Address 00007FFF Fail Num 000007 PROGRAM JER Checksum cooo Clear Count Block Check Writing GW uni Setting Information Operation Option Verification eee ee Key Lock 1 Device S3F8419 NUN Password Change Verify Start Address 00000000 complete Program Option End Address 00007FFF Auto Chip Erase Device Checksum Auto Verification
46. s Fail Num 000000 Checksum Clear Count GW uni Setting Information Operation Option Device S3FB4IS Libey Lack Password Change StartAddress 00000000 Program Option End Address 00000000 IV Auto Chip Erase F Auto Verification Checksum 0000 F Auto Blank Checking F Auto Read Protection vDD V 5 0 I Auto LDC Protection F Auto Hard Lock VED 5 0 SMART Option Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Open an hex filet Connected Figure 3 5 1 File open 2 Select a file hex or bin G ASRS GW uni Fila Execution P Device Samsung MCU S3F9A _voo s v amp amp s ww usrImtpoesulu GW uni is connected Data Information Program Count Start Address Success Num 000000 D BE HAD E Testfile gt Aer B GP 3FFFH_55h hex rest O1 FF _AK bin test 01 FF _256K bin eom c FF 8K bin test 01 FF _512K bin Ug TFFFH2 hex bin test bin TFFFH_3 hex TFFFH_5 hex g TFFFH_4 hex ee test 01 FF 128K bin Te 08N tesOT FF 32K bin Te SAD HEXFileCs hex BIN FileCs bin 7 H 5 0 I SMART Option Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Ready Connected Figure 3 5 2 File selection 8 SSEMINI GW uni SAMSUNG MCU gang programmer 3 Check the en
47. save it as an intel hex file to PC 1 Click Read Buffer button and the password window is displayed 5 test 01 FF 32K bin GW uni Eile Execution Program Option Help Device Samsung MCU S3F8419 Sa amp voo 5 0v Download Success PROGRAM Erase Block Check Writing Verification complete Verify complete Device Checksum C000 Buffer Checksum Socket State Data Information StartAddress 00000000 End Address 00007FFF Checksum C000 GW uni Setting Information Device S3F8419 Start Address 00000000 End Address 00007FFF Checksum cooo vDDM 5 0 VPP 5 0 3 ws Success Num 000001 Fail Num 000007 Clear Count Operation Option Key Lock Password Change Program Option IV Auto Chip Erase IV Auto Verification IV Auto Blank Checking F Auto Read Protection F Auto LDC Protection F Auto Hard Lock IV SMART Option SOCKET 1 SOCKET 5 SOCKET 6 Read Buffer SOCKET 2 SOCKET 3 SOCKET 7 SOCKET it8 Connected SOCKET 4 Figure 3 17 1 Read Buffer execution 2 Input password and click Check button and start to execute Read Buffer Gr test 0I FF 32K bin GW uni File Execut te Helr Device Samsung MCU S3F8419 E vod s ov BAacwe DM ER C d D b amp DN Download Success PROGRAM Erase Block Check Wr
48. tttest End Address 00007FFF Fail Num 000000 01 FF 32K bin Checksum cooo __ClearCount GW uni Setting Information Operation Option Key Lock Password Change Program Option End Address 00000000 F Auto Chip po IV Auto Verification Checksum 0000 IV Auto Blank Checking Auto Read Protection vDDM 5 0 IV Auto LDC Protection VPP 125 d Auto E aha Device S3P7048 Start Address 00000000 Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET it4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Connected Figure 3 22 GW uni setting window 1 2 3 4 5 6 Device Display a device name Start Address Display a program start address End Address Dispaly a program end address Checksum Display a data checksum which is downloaded VDD Display a system voltage we 2 was a wo we VPP Display a program voltage GW uni works based on GW uni setting information so check whether GW uni setting is changed after changing GW uni setting information device information Program option Download etc The setting value is displayed when GW uni is connected to PC GW uni normally 27 semmn lt GW uni SAMSUNG MCU gang programmer 3 23 Upgrade Upgrade GW uni software Please check a new firmware file at SEMINIX homepage www seminix com periodically User can check the version information at Help gt About GW uni menu 1 Upgrade
49. unt Start Address 00000000 Success Nu 000001 Open HEX File p C WProjectsWTest filetitest End Address 00007FFF Fail Num 000007 01 FFJ 32K Checksum cooo Clear Count Download Success GW uni Setting Information Operation Option ETTE r PROGRAM Device S3F8419 Key Lock Erase Password Change Block Check Start Address 00000000 Writing Program Option Verification End Address 00007FFF IV Auto Chip Erase complete ers IV Auto Verification Checksum cooo Auto Blank Checking ue F Auto Read Protection VODIY 5 0 I Auto LDC Protection p F Auto Hard Lock EEO 5 0 IV SMART Option Socket State SUCCESS Connected Figure 3 10 Program 3 11 Verify Display the result after comparing a written data of a device and a data of a GW uni buffer memory Om test 01 FF _32K bin GW uni File Execution Program Option Help E Device Samsung MCU S3F84I9 von sov j ver sov Barr nm GW uni is connected Compare devices wiht the buffer memory Program Count Start Address 00000000 Success Num 000001 Open HEX File m C Projects Test filetttest End Address 00007FFF Fail Num 000007 017FF 32K bin Checksum C000 ClearCount GW uni Setting Information Operation Option z F Key Lock PROGRAM Device S3F8419 Erase Password Change Block Check Start Address 00000
50. unt and clicks Clear Count button Ch test 0I FF 32K bin GW uni gt yoo sav Device Samsung MCU S3F84I9 Ba dc ge DM EARR DPA GW uni is connected Open HEX File C WProjectsWTest filetttest 017FF 32K bin PROGRAM Erase Block Check Writing Verification complete Chip Erase complete Blank Check complete Socket State Data Information Start Address 00000000 End Address 00007FFF Checksum cooo Clear Count Clear Count Password E VPP 5 0v Program Count Success Num 000003 Fail Num 000021 xj ration Option Key Lock Password Change pram Option Auto Chip Erase Auto Verification Auto Blank Checking F Auto Read Protection F Auto LDC Protection F Auto Hard Lock iv SMART Option SUCCESS FAIL FAIL Connected Figure 3 8 2 Clear Count 13 SSEMINI GW uni SAMSUNG MCU gang programmer 5 The Success Count Cleared message window is showed when the initialization is normally finished 5test 0I FF 32K bin GW uni tic Proaram Opti ior T n Device Samsung MCU S3F8419 amp 2 c w m GW uni is connected Data Information Program Count Start Address 00000000 Success Num 000003 Open HEX File z C ProjectstTest filetttest End ddress 00007FFF Fail Num 000021 I3 EE Sabin Checksum C000 PROGRAM Erase ration Option Block C
51. word Change Start Address Program Option End Address Auto Chip Erase p F Auto Verification Checksum Auto Blank Checking a F Auto Read Protection VDD F Auto LDC Protection F Auto Hard Lock VPP SMART Option Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Ready Disconnected Figure 3 3 1 USB Connection 2 GW uni is connected message and information of GW uni setting Program count and Program Option setting are displayed when GW uni is connected by USB 5 ASLE GW uni DER Eile Execution Program Option Help 7 Device E VDD VPP Aa uc xw YBARRO DaD GW uni is connected Data Information Program Count Start Address Success Num 000000 End Address Fail Num 000000 Checksum Clear Count GW uni Setting Information Operation Option Device NOTHING GER Password Change Start Address 00000000 Program Option End Address 00000000 IV Auto Chip Erase Auto Verification Checksum 0000 F Auto Blank Checking F Auto Read Protection VDD 3 3 I Auto LDC Protection F Auto Hard Lock VPP 3 3 SMART Option Socket State SOCKET 1 SOCKET 2 SOCKET 3 SOCKET 4 SOCKET 5 SOCKET 6 SOCKET 7 SOCKET 8 Ready Connected Figure 3 3 2 Finish USB connection Try from 1 again when USB connection is failed 5 SSE

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