User Manuel - ProT Ar-Ge
Contents
1. Endiistriyel Proje Tasarim Ar Ge Ltd Sti Industrial Project Design R amp D Co Ltd Prot JUN illl iu Address Alaaddinbey Mh 628 Sok Elektromekanik Is Merkezi No 1 C Nil fer 16000 BURSA TURKEY Phone 00 90 224 223 17 45 Fax 00 90 224 221 74 53 export protarge com www protarge com 332. Dual channel Oscilloscope Square Wave Generator and Analog Voltage output When the Square Wave Signal Output is used a signal is applied to the electronic board and the other channels display the output signals on the oscilloscope screen Technicians engineers and hobbyists have found VI graph to be an effective and efficient method for troubleshooting printed circuit boards The signature comparison method is easy to use and allows for immediate feedback that will assist you in locating faulty component As you gain some experience with VI graph you will realize that FADOS7F1 is an indispensable troubleshooting tool Usage is very easy and users will find the faults just by looking at graphs without comparison When test Printed Circuit Assembly PCA with FADOS7F1 do not apply power to PCA PCA and the devices must be made high voltage capacitor discharges There is no risk of further damage to the PCA while testing and troubleshooting FADOS7F1 is easy to carry since it s small It can be carried in a laptop briefcase Including many more features it is like a Swiss knife of users dealing with electronics Usage Areas ECU Automotive electronic circuit boards servo step motor drivers circuit boards of medical devices military electronic circuit boards computer and monitor circuit boards television audio radio circuit boards circuit boards of textile machines mobile phone electronic circuit boards etc all type electroni
3. There may be capacitors and resistors connected as well If there is a dual reverse diode connected to the pin of the integrated circuit it can be said that this pin is intact In particular if there is complete matching in the comparison this point should be good PE ANALOG OUTPU ISCILLOSCO OS ER FAULT DETECTOR VI TEST V Comparison M Capacitor Test PARRES Memory Save Test Tolerance 3 Diff 0 Harmonious ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Picture 23 Comparison Test Integrated circuit is usually double reverse diode It can be capacitors or resistors are connected to these If pin of integrated has double reverse diode it means this pin can be good solid OUTPUT OPE ANALOG ISCILLOSC ESTER FAULT DETECTOR VIT J Memory Save Test Tolerance a ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Picture 24 Comparison Test Integrated Pin Faults 27 When a pin of the integrated circuit is destroyed the reverse diodes are broken so that a resistor open circuit or short circuit may appear Channel 1 2 W Automatic ANALOG OUTPUT OSCILLOSCOPE 3 M Capacitor Test M TTT FET ESTER Memory Save Test VIT ATTENTION Probe must be at 1X position High voltage capacitors must be
4. a resistor Tolerance 3 Zz IM Picture 6 Resistors VI Graphs The Equivalent Circuit Diagram and Value Measurement Channel 1 Red Channel 2 Blue FAULT DETECTOR VI TESTER I Test El Channel 1 2 An H FAULT DETECTOR VI TESTER FAULT DETECTOR VI TESTER Picture 7 Resistors VI Graphs Picture 8 Short Circuit Channel 1 and Resistor VI Graph Channel 2 16 Capacitor and Inductor VI Graph The energy storing devices leak voltage and current in the phase shift area This situation creates a circular or elliptical shape on the screen The capacitor current voltage VI graph equivalent circuit diagram and values are shown in Picture 9 10 Picture 9 10 displays capacitor typical signals and values for the equivalent circuit The VI graphs of the high value capacitors are displayed on the vertical axis For testing high capacitor select high current and low frequency The VI graphs of the medium value capacitors are elliptical close to a circle Low capacitor generates horizontal ellipse For testing low capacitor lower than 10 nF select low current and high frequency The Picture 11 below shows the signature of a ferrite transformer primary winding with the test voltage range set Low and test frequency set High This demonstrates the effect of a significant value of resistance causing the inductive ellipse to be tilted ND OSCILLO SCOPE A A ATA asa Test Channel 1 2 OUTPU
5. e Inthe Hardware tab click the Device Manager Button Or e Click Start e Click Settings e Click Control Panel e Inthe Control Panel double click the Systems icon e Inthe System Properties window click the Hardware tab e Inthe Hardware tab click the Device Manager Button 3 Find Prot Ar Ge FADOS7F1 Fault Detector inside Universal Serial Bus Controllers and click right then select update software driver 4 Select Search for the best driver location and click browse find FADOS7F1 Driver s folder 5 Click OK and install driver Note Each product has different calibration settings so that please do not lost program CD CONNECT PROBES Probes can be connected each socket Yellow ring probe is always Channel 1 Blue ring probe is always Channel 2 Crocodile probe is always COM USB cable for using communications between PC and FADOS 7F1 11 GENERAL USAGE INFORMATION 1 Product Oscilloscope Analog Output screen pop up and if you click Fault Detector VI Tester button input screen Fault Detect 2 Open circuit s graph is in the middle and horizontal position at Test Fault Detect screen Current Voltage Graph VI makes angle according to the value of resistance capacitor is like circle and ellipse short circuit is vertical position 3 In the Medium current mode in the areas with high resistor values if the VI graph is closer to the horizontal axis you can see the resistors with high val
6. emptied by using a resistor ETESNTAC A TECTOR Tolerance 3 Channel 1 2 mo Automatic ANALOG OUTPUT OSCILLOSCOPE STER Memory Save Test VI TES bh Wt Ar LgeHLIOIN ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor DETECTOR ILT Tolerance 3 Picture 26 Comparison Test Parallel Resistor Faults 28 An important difference to be observed in Picture 26 is the missing resistor in the reference circuit This may result from a broken trace leading to the resistor or a cold solder at the resistor lead The reverse diodes are caused by the integrated circuit os m EP E a SIR SPP tFADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE l Channel 1 2 Automatic OUTPUT ANALOG ISCOPE W Comparison Capacitor Test M TT T FET IGBI r Memory Save Test Diff 6 Attention ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor FAULT DETECTOR VI Tolerance 3 M Comparison M Capacitor Test ER Memory Save Test VI TEST ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor ETECTOR FAULT DI Tolerance 3 Picture 28 Comparison Test 29 3G 3 DIFFERENT GRAPHS DISPLAY By pushing the 1G button you can display 2G e g 2 graphs or 3G e g 3 grap
7. from card easily p Didnt a ii Aid Capena MoO yO OM prc yy COTY weroororer Function 4 Recording Ch2 data and comparing with recorded data R 8 0K D1 0 6 V R1 2 98 K D2 0 55 V Tolerance 3 R2 1 21 K FAULT DETECTOR VI TESTER Picture 3 FADOS7F1 Fault Detector VI Tester Screen FADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE Osciloscope Function 5 Double Channel Oscilloscope Function 6 Square wave Generator Function 7 Analogue Voltage Output Channel bha F d ADVICE Use Probe is10X position Analog Outpk Channel 2 gt r Design a a Probe X1 Top Value 0 00 V _ Active Low Value 0 00 V a z Frequence 800 Point f Signal Frequen COM Voltage mv 3200 oY Li T 0 Li E ae r O ES O Lu Li o FS al ay lt Le Picture 4 FADOS7F1 Oscilloscope Analog Output Screen 10 INSTALLATION 1 Connect FADOS7F1 to PC via USB Install drivers in CD 2 Click FADOS7F1 SETUP exe and install program 3 Run FADOS7HF1 exe DRIVER INSTALLATION 1 Connect FADOS7F1 to PC via USB Windows XP New Hardware Found with warning direct you to install the driver Insert the CD into the CD rom and install the driver 2 Windows Vista and Windows 7 open Device Manager e On the desktop right click on my computer and click Properties of open the Control Panel and double click the System icon e Inthe System Properties window click the Hardware tab
8. 03_13 dat Change In order to change the data of a saved Inc Increments the numbers automatically _ Change Save Saves the value of the test point to the file specified with a given name N071_ULN2003 12 dat NOT ULN2003 16 dat test point select the saved test point and click on NO dal the Change button to change the saved data N018_55 dat Open Opens the data for the marked test point as reference o Channel 1 Delete Deletes the data for the marked test point Recording The Test Points With Image from the computer Open a new folder for the board to be recorded Click on Load Figure to select the photograph of the circuit from the window opened The software changes the name of the photograph to image automatically For example if the name of the photograph is Figure jpg the software changes the name of the photograph to image jpg automatically and adds to the file If you want to add a photograph to the folder you need to change the name of the photograph as image jpg since the software checks the files named image jpg only If the name is not written as image jpg this feature will not work After loading the figure a photograph of the circuit is shown at the lower right corner of the VI test screen The green buttons on the photograph for zooming Select the point to be recorded on the photograph then touch the Channel 1 probe to that poin
9. 2 A FADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE l Test Channel 1 2 Automatic OSCILLOSCOPE ANALOG OUTPUT Li NA Fea Memory Save Test o ems ste be aan iran voltage Capacitors must be emptied by using a resistor Ch1 Ch2 Tolerance E Picture 19 Good Solid Integrated Pins Compare 2 Integrated Pins FAULT DETECTOR VI TESTER SAVING AN ELECTRONIC CIRCUIT BOARD TO THE MEMORY AND COMPARING FROM MEMORY Another feature of the FADOS7F1 Trouble Shooting Device and PC Oscilloscope is the ability to record save the points of the electronic circuits in the computer Click on the Recording Test from the FADOS7F1 test features to open the Recording Menu Create a new folder by writing the name or code of the circuit The name of the point data to be recorded is written in the New Recording Touch the Channel 1 probe to the point to be recorded and make sequential recordings by pushing the record button If no data name is assigned to the New Recording the software records the data under the names N001 NOO2 etc in numerical order Maximum 999 data can be recorded for each recording folder If you select Add Number the software adds numbers to the data automatically and if Increase is selected the software increases the numbers automatically In order to test from saved file press record memorized test button select data to be tested and open f
10. DATIONS sir 32 WARRANTY AND CONDITION Siria 33 FADOS7F1 FAULT DETECTOR amp OSCILLOSCOPE Picture 2 FADOS F1 FADOS7F1 includes 7 important functions 1 Double Channel Fault Detection Analog Signature Analysis VI Graph Comparing good and faulty or suspect circuit boards without giving power to boards 2 Equivalent Circuit Diagram Composing R C or Diode Circuit Diagram according to the point touched 3 Measuring Value of Resistors Capacitors and Diodes Feature of measuring the value of touched point 4 Fault Detection by Comparison from Memory By recording data of good circuit boards to memory comparing faulty or suspects boards from memory 5 Double Channel Digital Oscilloscope As occasion may require device can be used as oscilloscope 6 Square Wave Signal Output Ch 1 is used as oscilloscope and Ch 2 is used as signal generator 7 Analogue Voltage Output Ch 1 is used as oscilloscope and Ch 2 gives analog voltage output 9 FADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE Test Channel 1 2 Function 1 Double Channel V I Tester L Current 47K M Current 2K7 OL O O a lt Z XI Lil oO O O 02 O Ed O 09 O T Comparison Capacitor Test E Memory Save Test Function 2 Eguivalent circuit diagram By using functions 2 and 3 components Recording values can be measured without dismantling Function 3 Multicomponent measurement the components
11. T ANALOG ISCOPE _L Current 47K rs EA r i Comparison M Capacitor Test pata FEF IGB EE AS ST Memory Save Test ce C FAULT DETECTOR VIT FAULT DETECT VI TESTER FAULT DETECTOR VI TESTER n Circuit Picture 10 Capacitor VI Graph Picture 11 Inductor VI Graph 17 Capacitor Quality Test and RC Circuit When Capacitor Test is selected an additional curve displaying the quality of capacitor appears If this curve is at horizontal axis or close to it quality is high and quality is low as much as the angle degree is high High quality capacitor generates a horizontal line o w N w tb VI TESTER ECTOR FAULT DETECTOR FAULT DET Picture 13 Low Quality Capacitor 15 x Channel 1 2 Automatic ANALOG OUTPUT PE SCILLOSCC OS Comparison l Capacitor Test TTTFET IE Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor FAULT DETECTOR VI Tolerance 3 Picture 14 Capacitor and RC Circuit The axis of the graphs for the RC circuits comprising Resistors and Capacitors makes an angle 18 SEMI CONDUCTORS VI GRAPH Diode Zener Diode VI Graph Diodes start to transmit current after high transmission voltage For this reason diodes are seen horizontally at one part of the graph and are seen vertically at the o
12. c circuit boards Electronic Components Test Resistors Capacitors Inductors Diodes General purpose Zener High Voltage etc Transistors NPN PNP JFET MOSFET etc SCRs TRIACs Optocouplers Integrated Circuits Digital Analog etc Unique Features Equivalent circuit diagram and measuring values of all components features as an example if resistor connected parallel to capacitor it shows circuit diagram and value of them at the same time SECURITY 1 N W a gt I 5 0 1 FADOS7F1 is produced by using lead free solder and designed in accordance CE regulations users must use the following usage rules Chassis must be isolated and grounded Connect the chassis ground connection point of the probe is the same as your computer careful to avoid the potential difference Feature of oscilloscope if probe key is set to 1X it measures 5 Voltage probe key is set to 10X it measures 50 Voltage Do not use above these limits of voltage It tests electronic circuit boards without giving to energy Before test electronic circuit board and the devices must be made high voltage capacitor discharges The users of this equipment must have knowledge and experience to repair of electronic circuit boards Thus during using FADOS7F1 do not make this mistakes such as touch chassis to high voltage non isolated ground test high voltage capacitor discharges Without enough knowledge and experience in t
13. ence 1800 Voltage mV 2600 Picture 31 Oscilloscope Screen Osc Active Passive The Oscilloscope button makes the Oscilloscope active or freezes the current image and saves the image to the memory by pushing the recording button Channel Selects channel Channel1 Channel2 and both channels are selected in an order Manual Auto When the Manual setting is selected the signals within the Lower Limit mV and Upper Limit mV values are captured On Automatic the last signal is captured when the signal is cut off Save Saves oscilloscope data or opens recorded data Channel Channel is selected for synchronous Up Down Starts synchronization at the rising or falling edge Probe X1 Adjusts the voltage value of the probe by the X1 or X10 level Top or Low Highest or lowest value on screen Point Shows the voltage value at a vertical line to the cursor in the memory Frequency Shows the frequency if the frequency of the incoming signal can be detected Active Passive When this button is clicked a square wave or analog output is generated at Channel 2 Signal DAC Selects Square wave or analog voltage Frequency Output frequency Voltage Voltage of square wave or analogue output 31 Voltage Display Sensitivity Voltage Division Adjusts the voltage display sensitivity The accuracy of the data received from the product does not change The figures show the voltage value If the fi
14. es may show all of them as intact The best capacitor quality measurements can be done by looking at the Capacity Resistor Curve with this product While making this measurement adjust the frequency and current to become longer on the vertical axis of the graph but without forming a multiple and thin graph 7 In case of a misshapen capacitor graph due to the effects of the diodes in the circuit the value of the capacitor can be measured again after eliminating the effects of the diodes 8 The important issue in trouble shooting is the shape of the graphs and their interpretation Try to find the defects by comparing when starting You should be able to distinguish the graphs of the good and defective materials in a short time The Equivalent circuit diagram and values will aid you in the process If you concentrate on the values in the equivalent circuit diagnosing may take longer Use the values of the components as necessary but do not well on the values alone like the measurement logic of the test equipment The evaluation logic of this product is based on the interpretation of the graphs e interpreting the graphs produced by the computer and generating the equivalent circuit diagram and showing the associated values VI TEST PROGRAM FEATURES OF FAULT DETECTION PART While testing with V I graph do not apply power to board Generally probe chassis is connected to board chassis and a signal is applied to touch point by
15. est If tolerance of test point is lower than or equal to tolerance mentioned below it goes to next test point automatically Reference Channel1 indicates good solid circuit Channel2 indicates faulty circuit or circuit to be tested When saved at memory Reference Channell is saved Values of circuits composed of resistance capacitor and diode are displayed PASSIVE COMPONENTS R L C RESISTOR INDUCTOR CAPACITOR V I GRAPH Resistor VI Graph Resistor signatures appear with a specific angle to horizon and resistor symbol and value are seen at the bottom of the graph While resistors at high values appear with angle close to horizontal axis resistors at low values are seen at screen with an angle close to vertical axis Picture 6 7 display resistors typical signals and values for the equivalent circuit Picture 8 short and open circuit The resistors of high values produce graphs closer to the horizontal axis Therefore while testing the resistors of high value select the Low Current Level The resistors of low values produce graphs closer to the vertical axis Therefore while testing the resistors of low value select the High Current Level tFADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE Test Channel 1 2 m Automatic OSCILLOSCOPE ANALOG OUTPUT rr Comparison M Capacitor Test Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using
16. gures are double clicked the 0 V reference of the channel is taken as the point clicked Data received from device is 12 Bit 2 5mV sensitive Zero Adjustment Shifts the 0 V point of the image upwards or downwards The figures show the voltage value If the figures are double clicked the O V reference of the channel is starts the point clicked Starting Point Sets the starting point of the displayed section of the image in the Memory mode Time Adjustment Time Division Adjusts the time allocated to each division on the horizontal axis time axis RECOMMENDATIONS pl The probes should be set to 1X while trouble shooting fault detection Test good solid circuit board channel 1 faulty or suspect circuit board channel 2 First touch the channel 1 probe and then touch channel 2 probes The important aspect in trouble shooting is the matching of the graphs The lower circuit diagram and values are for assistance purposes The values in the circuit diagram are not for measurement but for comparison Wrong indications may be given with the effects of the other components on the board While using the device testing at the medium current level is recommended When necessary use the low current level i e high value resistors or low value capacitors When recording in the memory click save button after touching good solid circuit board s pins with channel 1 When the data ope
17. his subject keep away high voltages such as mains voltage which can damage the system and themselves Giving high voltage from probes series resistors which contained in the device damaged and makes the circuit an open circuit In this case the computer port which is connected device via USB port damaged but observed in other parts of the computer is not damaged FADOS7F1 PERFORMANS AND MEASURUMENT TOLERANCE 1 N FADOS7F1 is designed multi function as Voltage Current VI Signature Analysis Tester and Oscilloscope The main of the feature device is VI Tester in addition to this feature computer software by analyzing voltage current graph to displays equivalent circuit diagram and values of electronic components in specific tolerances The equivalent circuit diagram and values are for informational purposes As the device is not suitable for direct measurement Equivalent circuit diagram is drawing by software using mathematical functions and formulas but rarely has the possibility of making mistake This probability is more increased with applied externally electromagnetic fields of generated interference The EMC Testing 3V M and the range of 80MHz 1GHz is approximately capacitor Sol resistor 3 diodes 1 Some fast diodes make oscillation in some frequencies so that can be perceived as active point by the device VI Graph the rate of change lt 1 3 Components Value Measurement Tolerance Note e Resisto
18. hs on the monitor simultaneously selecting different voltage frequency current levels cto tFADOS7F1_ FAULT DETECTOR AND OSCILLOSCOPE OUTPUT ANALOG ISCOPE IT Comparison T Capacitor Test Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Tolerance i 3 Open Circuit Picture 29 3G Graph Display OUTPUT ANALOG PE ISCILLOSCO FT Comparison T Capacitor Test M TT T FET IGB Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Tol 3 olerance ia Open Circuit Picture 30 3G Graph Display 30 OSCILLOSCOPE PROGRAM FEATURES A FADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE F r Osciloscope Pr Osc Active Channel 1 r Synchronous Channel 1 1 Channel Point Frequen Probe X1 Top Value 3 21V Low Value 0 00 V 0 8 KHz FAULT DETECTOR VI TESTER Point 2 Channel Probe X1 Top Value 0 00 V Low Value 0 00 Y Frequen Analog Outpk Channel 2 Active Signal E 800 Frequence Voltage mV 3200 Osc Active Channel 1 2 Automatic Save JU Channel 1 Up Probe X1 Top Value 131V Low Value 1 30 Y Point Frequen 1 8 KHz Active Signal Frequ
19. irst saved point Saved data is seen as a red graph at first channel Touch the point to be tested with second channel If it is same as the saved data or in tolerance values it is 23 written Harmonious at screen If it is out of tolerance values it is written Disharmony percentage value is seen and wrong voice is heard When automatic test is activated if a test point is harmonious then it goes to next point automatically This feature allows rapid testing without having to look at the monitor Note The test points of the Electronic may be recorded only with Channel 1 The test points saved with the Recording Menu can be opened as reference and the points on the defective circuit can be compared with those using Channel 2 ME lim New Folder Opens a folder on the computer s hard New Folder CA Test Circuit 3 Program Files ESFADOS7F1 103 Step 1 New Folder Step TOpen image disk for a new circuit with a given name Open Image Open and upload the circuit of the image New Point The name of the point to be recorded is ce Test Circuit New Point ULN2003 written if left blank the software adds the numbers NO01 NOO2 etc to the file automatically Add Number Adds a number to the test points Y Add M Inc 1 automatically Tol Save NO05_55 dat NO06_55 dat NOD ULN2003_8 dat 3 MDDS ULN2003_9 dat ODS ULN2003 10 dat Open N010_ULN 2003 11 dat ULN2003_10 NO12_ULN20
20. ltage level only can be selected for a test Frequency Step The frequency to be applied to the board is selected by manually selecting out of the Multi Low Frequency Low 2 Frequency Low 1 Frequency Test Frequency High Frequency levels One frequency level only can be selected for a test Current Step The current to be applied to the board is selected by manually selecting out of the Low Current Medium Current High Current levels One current level only can be selected for a test Comparison If this option is selected good solid and faulty or suspect circuit boards are compared by touching probes to the same points of both circuit board Capacitor Test Capacitor test determines quality of electrolytic capacitor TTT FET IGBT If this option is selected determines TTT FET IGBT etc Type of semi conductors Recording Opens the file format and starts recording or opens a saved file Grf Allows selecting graphs in 3 different settings voltage frequency current and switching rapidly 1G 2G 3G Graphs in 1 2 or 3 different settings can be displayed on the screen at the same time Recording Opens file form and records or opens recorded file Circuit Indicates name or code of point to be tested Folder name in the system Point Name or code of test point Recorded as file name in the system Goes to previous test point gt Goes to next test point Test Point Serial number of test point Auto T
21. n from memory using Channel 2 comparison data with faulty suspect or good solid circuit board In the Oscilloscope mode the 1X setting of the probe measures up to 5V and the 10X setting up to 50 volts Measuring high voltage circuits is not recommended Each product has different calibration settings The calibration file can be found on the CD in the program installation folder Please do not lose the program CD 32 WARRANTY AND CONDITIONS 1 The warranty period is 1 year from the date of product delivery 2 The repair period is seven 7 business days 3 Any defects arising out of not using the product in conformity with the instruction manual are not covered by the warranty If a higher voltage than the voltage values specified for the probes is used the series resistors connected to the probes burn out The burning of the resistors shows a user error because of not discharging the high voltage capacitors before use hence such conditions are excluded from the warranty 4 The device is in a solid box Normally use the card is not physically damaged The device is in an aluminum case therefore the electronic board cannot be damaged physically Breaking wetting etc are not covered by warranty 5 The probes may be damaged depending on use Therefore the probe malfunctions are not covered by the warranty 6 In case of device failure send the device to an authorized repair service or Prot Ar Ge Company
22. n manna nmm y poe s es DARDO a A an h s A E i N N a 3 an Ez i h 2 gon AA Eh E Ge E Ee li nA YY V uF ds Les La e ise ME E a J F m an mu rox a a ig a h 5 Eg i e 4 k 7 pla A i 5 E Im 3 y 4 a a AB J a dos cf i am i E U de y a i y FE y o PE s a n Fa ice FF Ja J 1 y AS 4 l y E Baia amp EF os YU Am Channel 1 2 ha as DIZE UIIS LIO IS MMM 3 y an Memory Save Test Recording are Circuit TEST2 Point R6_1 lt gt R 8 9K Test Point E D1 5 65 V m D2 04V D2 0 4 V Tolerance 3 ETECTO FAULT DI PRODUCT DESCRIPTION The Prot Ar Ge Endustriyel Proje Tasarim Teknolojik Ar Ge Ltd Sti Prot R amp D Industrial Project Design R amp D Ltd Co FADOS7F1 Trouble Shooting amp Oscilloscope Device is designed for trouble shooting all types of electronic boards The FADOS7F1 is a PC based VI Test Voltage Current Analysis device Signature Analysis is a power off test method that is used to troubleshoot circuit boards FADOS7F1 works by applying a current limited sine wave through a serial resistor point of touched on circuit and Voltage Current Signature graph is displayed on the computer screen In addition to these features the computer software analyzes the Voltage Current graph and shows the equivalent circuit diagram and the electronic components of the contact point Those futures are i
23. ncy 2 Hz Low2 Frequency 3 4 Hz Lowi Frequency 10 3 Hz Test Frequency 27 3 Hz High Frequency 780 Hz Number of Channels 2 Channel 1 and Channel 2 Scan Mode Manual or Automatic Automatic selection steps of voltage current frequency Other Feature 1 Equivalent circuit diagram 2 Resistor capacitors diodes etc measurement 3 Data recording and comparing from memory 4 Displaying 3 graphs of different settings at the same time PC OSCILLOSCOPE FEATURES Sampling Rate 400 K S Input Voltage Probe 1X 5 V Probe10X 50 V Channel ADC 2 Channel 12 Bit Sensitivity 2 5 mV Image Rate 0 02 mS div 100 mS div Momentary Memory 64 Kbyte DIGITAL AND ANALOG OUTPUT Output Channel 2 Output Voltage 5V 5V Adjustable Frequency Digital From 0 2KHz to 25KHz Connections Probes can be connected each socket Yellow ring probe is always Channel 1 Blue ring probe is always Channel 2 Crocodile probe is always COM USB cable for using communications between PC and FADOS7F1 Dimensions 105mm L x 54mm W x 24mm H Weight 450 gram with all accessories Table 1 FADOS7F1 Technical Features CONTENTS PRODUCT DESCRIPTIO Ni c 2 USAGE ARE ae nc se ce teen ac apa E 3 ELECTRONIC COMPONENTS ES LSe ide iaa reia an 3 UNIQUE ETRE o EEA 3 SECUR Iria a 4 FADOS7F1 PERFORMANS AND MEASURUMENT TOLERANCE ocococconoononnnnnnooo 5 PRODUCT OVERVIEW AND CONTENT ccscsssscesesscscnsesccsensesensensesensensesensenen
24. nious at screen If it is out of tolerance values it is written Disharmony percentage value is seen and wrong voice is heard 25 Test l Comparison Capacitor Test A TTT FET SRT ER Memory Save Test Diff 0 Harmon ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor FAULT DETECTOR VI TEST Tolerance a Picture 21 Comparison Test Comparing this system is very sensitive and is considered compatible with the values within the given tolerance OUTPUT DPE ANALOG SCILLOSCE OS L Current 47K MC n i an y W Comparison l Capacitor Test PARF FEF IGBI ER ST Memory Save Test C SAL o IL AUCnuon ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Ch2 R 10 0K D2 0 4 V FAULT DETECTOR VI T Tolerance ia Picture 22 Comparison Test In this system multiple accurate comparisons are made and the values falling within the tolerances specified are considered as compatible But in case of small differences determining is defective or not is left to the experience of the user An important difference to be observed in Picture 22 is the difference of the resistor s value in the test circuit This is caused by the 26 integrated circuits with reverse diodes The integrated circuits usually contain reverse diodes
25. ntended to provide guidance to the user in order to facilitate trouble shooting Using the Dual Channel VI test feature the intact and defective or suspect electronic boards can be compared by touching the same points on each board at the same time thus the out of tolerance malfunctions can easily be diagnosed with this method All the VI graphs are produced by the software making analyses at 720 separate points with an accuracy of 2 5 mV Therefore the FADOS7F1 is very accurate Memory Recording feature by means of this feature the characteristics of the intact electronic board VI graph equivalent circuit diagram and electronic components values are written on the computer s hard disk and taking these points as reference you can compare the defective or assumed to be defective electronic boards accurately easily and rapidly At the same time the data can be written on the photograph of the board Thus the recorded point can be seen on the photograph while making a comparison from the memory The software produces different sounds while comparing the matching and non matching points during the test thus allowing to concentrate only on the sound for a rapid comparison without having to look at a board or display continuously The user can compare the electronic boards from 3 different settings at the same time Selected Current Voltage Frequency steps In addition to the above features the VI FADOS7F1 Test Device can be used as a
26. on a chip to many thousands of components in for instance a modern microprocessor Because of the need to package so many components into an extremely small space components within an IC are often microscopically small As a result modern ICs contain components and connections which are susceptible to damage from electrical stress and static discharge at levels far lower than those which would damage normal components For this reason many ICs incorporate protection diodes on their signal input and output pins When testing integrates signals display similar to the double inverse diode zener diode and diodes It can be capacitors or resistors are connected to these If pin of integrated has double reverse diode it means this pin can be good We can use the same technique to locate faults in ICs which are large and very complex such as memory chips and microprocessors The pin arrangement of such complex ICs means that it is especially appropriate to use comparison techniques to test these devices As we look at these devices we will find that despite the large number of pins there are only a few distinct graph patterns on a digital IC Note You will frequently notice differences in the signatures between similar ICs from different vendors or which have been manufactured using different technologies Compare the graph on a suspect pin with graphs from other pins on the same device before regarding the device as faulty 2
27. r Triac Thyristor FET IGBT VI Graph Active components such as transistor triac and FET can be tested by transmitting them while both of two channels are used A transistor contains two semiconductor junctions connected Transistors also must have emitter chassis First touch collector with a probe Channel 1 probe or Channel 2 probe Collector must be at non transmission position Then touch other probe Channel 1 probe or Channel 2 probe base in order to provide transistor to start transmitting Transistor characteristics should be seen as at the screen Lack of any leak at the junction point fully horizontal supports the soundness of the material The FET is comprised of a channel containing semi conductor materials and another zone gate made of a semi conductor material opposite to the foregoing The Gate shapes the diode with the connections at both ends of the channel source and drain and those diodes can be tested Both probes are used for testing the 3 pin active components One probe shows the trigger signal and the other shows the conduction state If conduction occurs click T T T FET IGTB from the test types menu and the software checks if the FET MOSFET is of the N or P type 20 MOSFET are field effect transistors Gate drain and gate source tests generally yield an open circuit mark However some MOSFETs have a protective diode between the gate and source In such cases the gate source marking is simila
28. r 2 e Capacitor 3 e Diode Transmit Voltage 0 1V e If Resistor and Capacitor are connected Parallel Resistor 4 Capacitor 5 e If Resistor and Diodes are connected Serial 4 e If Diode and Resistor are connected Parallel 3 e If 2 Diodes and a Resistor are connected Parallel 10 1 These tolerances valid if resistor curve makes angle between 10 and 80 degree to horizontal axis If resistor curve close to horizontal line select Low Current Step and if resistor curve close to vertical line select Middle or High Current Step for reducing mistake rate Note 2 These tolerance valid if capacitor ellipse of width length ratio is greater than 1 4 This ratio is less than 1 4 and ellipse s width length is thin and long In such a case change current step or and frequency step for selecting step appropriate to components 4 Oscilloscope voltage measurement tolerance 0 5 PRODUCT OVERVIEW and CONTENT e 1FADOS7F1 Product e 1 Software CD and User Manual Pdf e 2 Oscilloscope Probes e 1 Com Probe Crocodile e 1 USB Cable e 1 Handbag FA D OS 7 F FAULT DETECTOR amp OSCILLOSCOPE 7 FUNCTION IN 1 MULTI FUNCTIONAL CIRCUIT BOARD TESTER ProT Ar Ge Picture 1 FADOS7F1 Sets FADOS7F1 TECHNICAL SPECIFICATIONS A O FAULT DETECTION SPECIFICATIONS Test Voltages 1V 2V 5V 10V Test Resistance Current Level Low 47 KQ Medium 2 6 KQ High 385 Q Test Frequencies Very Low Freque
29. r to a zener diode Those are checked like the FET using the source drain conduction and gate source voltage The MOSFETs on the other hand are checked by means of the normal and reverse polarization of the gate source junction Triac Thyristor IGBT can be tested in the same way If Thyristor Triac Transistor FET IGBT selection T T T FET IGBT button is applied type of component can be determined FADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE OSCILLOSCOPE ANALOG OUTPUT rr Comparison Capacitor Test r Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor FAULT DETECTOR VI TESTER Tolerance a Picture 17 Transistor VI Graph FADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE Test Channel 1 2 tV 2V E v1 BU be a Very Low Fri Low 2 Fr Et tii ld E OSCILLOSCOPE ANALOG OUTPUT L Current 47K Curren 2K Comparison M Capacitor Test v Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor FAULT DETECTOR VI TESTER Tolerance a Picture 18 FET VI Graph 21 INTEGRATED CIRCUITS ICs SMD INTEGRATES Integrated circuits can be tested all the pins with the help of probes Circuits made up of many components encapsulated within a single package The component count within an IC may vary from as few as half a dozen devices
30. s 6 FADOS7F1 TECHNICAL SPECIFICATIONS sscescsssscnsessnsenscsensensesensenensensseens 7 FADOS7F1 FAULT DETECTOR amp OSCILLOSCOPE csssscssesssscnsensssensnensensenens 9 INSTALLATION DRIVER INSTALLATION carnada 11 CONNECT PROBES mmmmmmmmmmmmmmmmmmmmmmmmmmmmm m m mm mmmmmmmmmmmmm mmmm mmmmmmkyiH 11 GENERAL USAGE INFORMATION 0 cssescsscnsescnsensnsensessnsensesensensnsensesensenseses 12 VI TEST PROGRAM FEATURES OF FAULT DETECTON PART 0scescesenss 14 PASSIVE COMPONENTS R L C RESISTOR INDUCTOR CAPACITOR V TGRAP Hi aidai 16 RESISTOR VI GRAPH roads 16 CAPACITOR AND INDUCTOR VI GRAPH svessscevevcssuicvascsveveesvececeesscveuscscecavevencesasoecseseevens 17 CAPACITOR QUALITY TEST AND RG CIRCUIT aa 18 SEMI CUNDOCTORS V I GRAPH ocooccccococconcnnnncnnnnnnnnnnnnrn nena nrnnnrnnenannrmnnnanas 19 DIODE ZENER DIODE Vi GRAPH sonia allas 19 TRANSISTOR TRIAC THYRISTOR FET IGBT VI GRAPH eceeceeeeeeeeeeeeesesaeeesesansesaes 20 INTEGRATED CIRCUITS ICs SMD INTEGRATES V I GRAPH 0s000000 22 SAVING AN ELECTRONIC CIRCUIT BOARD TO THE MEMORY AND COMPARING FROM MEMOR Sia 23 RECORDING THE TEST POINTS WITH IMAGE arenas raros 24 COMPARATIVE TEST OF THE COMPONENTS IN THE CIRCUITS BOARDS 25 3G 3 DIFFERENT GRAPHS DISPLAY sscsssscesessesensessesensesensensesensseensenssees 30 OSCILLOSCOPE PROGRAM FEATURE sscsssscesenssscnsensssensensesensseensenseees 31 RECOMMEN
31. t and push the Record Save button 24 When you use this feature for comparing from the memory you can see the location of the saved point on the board BH FADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE gt OSE 7 a Test Channel 1 2 gt Automatic E Record i ac T New Folder c v SCA y Program Files MEETS 3 FADOS F1 1043 Step 1 New Folder Step 2 Open Image New Point jus i l Add Number Noo3_ULN2003 4 dat 13 MER H OL O O O a T Pa AI LJ OL O O UN O Saj cf O 0 O Open NO1 6 Ezopas _ Cancel _ ae Probe must be at 1X position High voltage capacitors must be emptied by using a resistor NO16 dat FAULT DETECTOR VI TESTER Tolerance 3 Picture 20 Recording Data With Image COMPARATIVE TEST OF THE COMPONENTS IN THE CIRCUITS BOARDS When a component is tested in the circuit the other parallel or serial components in the circuit cause a mixed signal to be generated The FADOS7F1 displays the mixed signals of the components on the electronic board and produces an equivalent circuit diagram to measure and compare the values of the components You can perform the test by connecting the card assumed to be good to Channel 1 and the suspect circuit to Channel 2 from the common points Comparisons can be made starting from the power supply to the board and progressing inputs and other suspected points If it is same as it is written Harmo
32. the device The V I graphic Signal appears on the screen Signals scans from negative voltage to positive voltage and when open circuit it appears horizontally in the middle of the screen All the control buttons to be used for trouble shooting are placed on the left hand side of the screen A FADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE Test Channel 1 2 OL pu O O O si lt Z XI W a O O 02 O Sag O 00 O L Current 47K 17 arrar ir A A SAM PELIN y M Comparison Capacitor Test Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor FAULT DETECTOR VI TESTER Tolerance E Picture 5 Fault Detector VI Tester Screen 14 Channel 1 2 Were Low Fro Low 2 Fro L Current 47K M Current 2K8 H Current 385 C Comparison L TIT FET IGBT Recording Ort FT Capacitor Test r MC a eS 4 Ir AUT Moe Circuit Test circuit Point 7805 1 Tolerance 3 Channel Used to select channel Auto When this setting is selected the most suitable value of the Voltage Frequency and Current levels are shown on the screen depending on the characteristics of the contact point Voltage Step The voltage to be applied to the board is selected by manually selecting out of the 1 V 2 V 5V 10 V voltage levels One vo
33. ther part If cathode of diode is connected to chassis a curve appears at horizontal axis at negative voltage and before transmits voltage and the curve appears at vertical axis at transmit voltage If anode of diode is at chassis a curve appears to down at negative voltage A Zener diode exhibits the same signature as a conventional diode for voltages below the Zener voltage When the reverse bias exceeds the Zener voltage a low resistance signature is displayed If diode and resistor are serial on circuit after transmission graph makes an angle to horizon A FADOS7F1 FAULT DETECTOR AND OSCILLOSCOPE l Test Channel 1 2 2 a b3 O O aa x Z XI Lil A O O 02 O a O 0 O Comparison M Capacitor Test Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor Chi Ch2 FAULT DETECTOR VI TESTER Tolerance 3 Picture 15 Diode and Serial Diode Resistor VI Graph The Equivalent Circuit Diagram 19 Test OUTPUT ANALOG Van PN IX SCOPE JOG 47K URII T Comparison T Capacitor Test TTT FET IOS Memory Save Test ATTENTION Probe must be at 1X position High voltage capacitors must be emptied by using a resistor FAULT DETECTOR VI TEST Tol 3 olerance 3 Open Circuit c Picture 16 Zener Diode VI Graph The Equivalent Circuit Diagram Transisto
34. ues more clearly by Switching to low current If the VI graph is too close to the vertical axis this means that the resistor value is low and you can read the values more clearly by switching to the high current mode 4 Please test the capacitors in the high frequency mode generally Use low current when the capacitor value is low and high current if the value is large If the capacitor value resembles a thin line in high current at the vertical axis you can see the value more clearly by reducing the frequency from the frequency mode 5 The pins of a good integrated circuit are generally in form of a dual reverse diode other than the supply and ground Although the attached resistors and or capacitors might affect the graph the two reverse diodes should be observed In the output of some integrated circuit only one diode may also be seen But an image in form of a resistor would most probably mean a defective integrated chip 6 The capacity test shows the quality of the electrolytic capacitor in particular The more horizontal this curve is the higher the quality of the capacitor is The angle of the deteriorating capacitor makes an angle with the horizontal If the angle is large it means a defective capacitor Because the circuit draws a current while in the board this test can be deceptive hence consider this while testing In case of doubt remove the capacitor from the circuit and then measure in this measurement the test devic
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