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Visual template-based thermal inspection system
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1. The entire content ofthe following U S Provisional Patent Applications is incorporated by reference herein 1 60 977 472 filed on Oct 4 2007 entitled VISUAL BASED THERMAL INSPECTION SYSTEM 2 61 027 616 filed on Feb 11 2008 entitled SYSTEM FOR AUTOMATIC ALIGNMENT OF THERMAL AND VIS IBLE IMAGES FIG 1 shows an embodiment in the form of a portable imaging device 10 A thermal infrared sensor 12 captures apparent surface temperature information based on amount of infrared radiation from an object of interest 14 The ther mal infrared sensor 12 may be a single element spot ther mometer type sensor or an imaging sensor with multiple pixels e g two dimensional A visible imaging camera 16 captures a visible image of the object of interest 14 with the area 18 observed by the visible imaging camera 16 not nec essarily being identical to the area 20 observed by the thermal infrared sensor 12 but generally with a large enough field of view to observe multiple areas which can act as reference points for future thermal readings Thermal infrared sensor data from the sensor 12 and visible image data from the camera 16 are both transmitted to a processing unit 22 which has access to non volatile memory 24 The non volatile memory 24 stores a reference edge image obtained by edge processing of the visible image captured during reference thermal data capture as described below During use of the imag
2. To reliably measure the temperature and temperature dis tribution of on object of interest against a baseline or trend it is important to match which areas are being compared in 20 25 30 35 40 45 50 55 60 65 2 recent and baseline images In the prior art images are com pared side by side possibly with the aid of PC based region of interest selection tools which allow the user to select corresponding areas in a sequence of images Such comparison restricts the trending and current vs baseline analysis to post collection processing on a PC or similar platform Moreover it can make such comparison extremely time consuming Finally because images may be taken from different angles or distances radiated energy may be different and difficult if not impossible to compare to a baseline or historical data In addition to variable occlusion of objects there is the potential for changes in perceived tem perature due to infrared sensor angle vs surface for objects with less than 10096 emissivity radiated energy may vary substantially with viewing angle In order to minimize variations in the images to be com pared some industrial users have taken to putting tape out lines on the floor in front of equipment to be monitored While this eliminates gross variations in images captured signifi cant changes from dataset to dataset will occur due to tool elevation angle rotation and of course user height a
3. Use ofa near infrared laser which may be observed by the visible image sensor but is invisible to the human opera tor and other humans in the environment Use of optics to project a pattern from the laser other than a simple center spot and provide the system depth data for multiple points in the field of view For example a grid pattern extending over the entire field of view of the visible camera and or thermal infrared sensor the position and distortion ofthis grid 0 5 25 40 45 55 60 10 pattern as seen by the visible camera provides mul tiple point depth information This depth information is then used to stretch either the thermal or visible information to register precisely at the measured points and with interpolation between these points More intelligence may be added to the image process ing to predict where large changes in depth occur between measured points for example where sharp edges in the visible and or thermal image are present Other solutions to the visible thermal registration problem have been proposed and implemented However these require additional equipment or components beyond what would be typically required to build a thermal infrared inspec tion tool with an integrated visible imager One example is the system described by U S Ser No 11 294 752 by Johnson et al where the user s manual focus of the thermal infrared camera component of the handheld device
4. depending on the sophistication of the ther mal infrared imaging device this could be inte grated into the device It should be noted that a similar baseline template could be generated using a near infrared camera instead of a visible camera or even from a thermal infrared image when the system employs an infrared imager not a spot thermometer Generation ofthe template using the visible light sensor has a number of advantages including typically higher spatial resolution in visible light cameras vs thermal infrared imag ers potentially higher contrast in the face of thermal conduc tion and convection and low temperature gradients higher signal to noise ratio as long as proper illumination is pro vided The edge image can be produced automatically in a num ber of manners using well known image processing tech niques For example a linear edge filter may be convolved with the image producing another image which has large values in areas where color or brightness values vary rapidly this resulting image may then be thresholded to produce a binary edge representation of the scene BRIEF DESCRIPTION OF THE DRAWINGS The foregoing and other objects features and advantages will be apparent from the following description of particular embodiments of the invention as illustrated in the accompa nying drawings in which like reference characters refer to the same parts throughout the different views The drawings are not necessa
5. DATA TO PC 20 SETUP AND STORE INSPECTION PARAMS ON PG 22 TRANSEER INSPECTION PARAMS HANDHELD DEV Ja FORM INSPECTIONS WITH HANDHELD DEY 88 PROVIDE ON LOCATION REAL TIME FEEDBACK AND d Sheet 6 of 8 AMAN AMAT P 2 TRANSFER REF DATA TO NETWORK 78 RE SOURCES TO SET UP amp STORE _ PARAMETERS 78 4 Xs isoliert OR NETWORK BASED LOGGING ANALYSIS 84 US 8 374 438 US 8 374 438 Sheet 7 of 8 Feb 12 2013 U S Patent 4 9 nmn nm nm snm sss ss s pou pP HH H H Fig 11 US 8 374 438 Sheet 8 of 8 Feb 12 2013 U S Patent cV 01 VH3WVO FIGISIA 201 vH3WNVO WWYSHL FOL MSLNIOd M3SV1 JOSS30O0Hd 801 YOSS3D0Yd JOVI 601 e LL AWIASIO US 8 374 438 1 VISUAL TEMPLATE BASED THERMAL INSPECTION SYSTEM BACKGROUND Infrared thermal measurement and thermal imaging are widely used for predictive and preventative maintenance operations because of their ability to image lost energy which may result from poor electrical connections mechanical fric tion electrical or mechanical overloads or othe
6. the device automatically captures the reading when adequate goodness of fit has been deter mined At this point the captured thermal infrared data has US 8 374 438 5 been captured from an orientation and distance identical to those for the capture of the reference thermal information The imaging device 10 may store the new thermal data in the nonvolatile memory 24 It may further process this informa tion using the reference thermal data as well as any param eters that were set at the time ofthe reference data capture for example surface emissivity ambient temperature or ambient temperature reference points in the thermal scene etc It may display a comparison for example a temperature dif ferential from the reference state on the display 26 Alterna tively it may compare the computed temperature differential with thresholds established at the time of the baseline refer ence capture and output simply In Range or OUT OF RANGE Alarm to the user who may then take immediate corrective action Such a simplified function could be useful for repetitive thermal infrared scans of electrical or mechani cal equipment either periodic scans of equipment in a loca tion such as a manufacturing plant or a spot check of a piece of equipment during field service for example a vehicle s engine A flow chart depicting how reference readings are acquired is shown in FIG 2 Reference thermal infrared data which may re
7. the laser pointer either in a pulsed or continuous mode and either auto matically or through user initiation Acquiring an image of the laser light reflected from the object using the visible image sensor Extracting from the image the position ofthe reflected laser light Using the position on the visible image of this reflection relative to a known position at a known distance to calculate distance to the object being measured dis tance gauging Using the known positions of the visible and thermal sen sors calculating of the spatial offset at the object between the visible image and the thermal infrared image Using the spatial offset performing real time or non real time registration of the thermal and visible images Displaying the registered thermal and visible images Optionally For every distance gauging operation acquiring two or more visible images in rapid succession to accurately measure laser spot location one image or set of images with the laser off in order to provide a background image and one image or set of images with the laser on Computation ofthe differential ofthese images or sets of images to provide an accurate location for the laser spot even in the presence of other bright light sources Continuous operation in this mode alternating frames with laser on and off Modulation of laser pulse duration in order to eliminate the effect of the laser light on the display of the visible image
8. this product as almost any infrared spot thermom eter does includes a laser designator corresponding to the spot being measured For the purpose of alignment the user is advised to print a photo showing the laser spot s and then use it as a reference for future inspections Besides the impracti cality of carrying a large book of photos around a plant the position of a laser spot on the object of interest does not uniquely determine sensor position vis vis the object caus ing potential discrepancies between measurements Similarly thermal infrared inspection cameras are offered with the option to add visible imaging to enable fusion displays in real time and offline reporting typically at costs of thousands of additional dollars However no alignment tools have been integrated into these cameras and users must still resort to looking back and forth to the baseline image on apiece of paper As a result the effectiveness of these inspec tion tools often upwards of 10 000 in price is dramati cally limited because no current vs baseline or trending analysis can be done in the field and such trend analysis is complex and time consuming even after the infrared image data has been loaded onto a PC for off line analysis because often a human must manually match new images with the baseline This limits the applicability of these products to expert users leaving a large reserve of technicians underuti lized SUMMARY
9. automatically aligns the resulting thermal image to the visible image In this system the point illuminated by the laser is used in conjunction with a virtual laser point on the screen for manual focus alignment by the user when the points coincide the object of interest being designated by the laser is in focus in the thermal system This solution solves both registration and focus problems but nonetheless has a number of shortcomings In low cost simple tools with fixed focus on the thermal infrared lens there is no manual or automatic focus mechanism and therefore no way to implement this solution It would be possible to use the visible imaging module which is available with auto focus capability for the same functionality However the autofocus drives and algorithms implemented in these modules rarely at least for low cost compact modules derive absolute distance which is a requirement for image reg istration This solution does not extend to a model where the image can be registered at multiple points in the scene and scenes may have a large variation in depth Again it would in theory be possible to use the multi area auto focus algorithms found in visible camera modules to derive depth at multiple points in the image but again most visible imaging modules do not calculate or report absolute distance in their autofocus routines disclosed device seeks to solve these significant issues and automate image reg
10. az United States Patent US008374438B1 10 Patent No US 8 374 438 B1 Wagner 45 Date of Patent Feb 12 2013 54 VISUAL TEMPLATE BASED THERMAL 430 203 351 559 617 955 200 510 359 362 INSPECTION SYSTEM 359 399 421 350 See application file for complete search history 75 Inventor Matthias Wagner Cambridge MA US 56 References Cited 73 Assignee Redshift Systems Corporation U S PATENT DOCUMENTS Burlington MA US 4 939 369 7 1990 Elabd 250 332 5 725 989 A 3 1998 Chang et al Notice Subject to any disclaimer the term of this BI a I ee e e ee patent is extended or adjusted under 35 7 280 678 B2 10 2007 Haven et al 382 117 U S C 154 b by 0 days 7457441 B2 11 2008 Hartlove 382 117 5 M 7 535 002 2 5 2009 Johnson et al This patent is subject to a terminal dis 7 538 326 B2 5 2009 Johnson etal 250 370 08 claimer 7 561 181 B2 7 2009 Schofield et al 348 148 7 651 261 B2 1 2010 Bunker et al 21 Appl No 13 370 558 7 983 446 B2 7 2011 Wiedemann et al 2004 0264542 Al 12 2004 Kienitz 22 Filed Feb 10 2012 2008 0099678 Al 5 2008 Johnson et al OTHER PUBLICATIONS Related U S Application Data Fluke Corporation The Fluke 576 Photographic Non Contact Ther 63 Continuation of application No 12 245 932 filed on mometer Infrared Temperature Measurement with Digital Photos Oct 6 2008 no
11. ct within the second sensor imaging field is generated using frames wherein the laser is modulated to be turned off 7 The imaging device of claim 4 wherein the image frames are processed to enhance detection of the laser illumination 8 The imaging device of claim 1 wherein the laser is outside the human visible wavelength range 9 The imaging device of claim 1 wherein the laser illumi nation consists of multiple points of illumination within the second sensor imaging field 10 The imaging device of claim 9 wherein the multiple points are in a grid pattern 11 The imaging device of claim 9 wherein the spatial registration offset varies across the second sensor imaging field 12 The imaging device of claim 9 wherein the spatial registration offset is used to predict the location of changes in depth within the second sensor imaging field 13 The imaging device of claim 9 wherein the spatial registration offset is used to predict the location of changes in depth within the first sensor imaging field 14 The imaging device of claim 9 wherein the signal processor performs an alignment process of a succession of image frames
12. e the ther mal infrared sensor is gathering radiation for its measure ment is not good for objects very close to the sensor Some tools have remedied this situation by incorporating two effec tive laser sources on two sides of the thermal sensor where the patterns from the two lasers align at the point where the laser path coincides with the area being measured by the thermal infrared sensor and at other points the area being measured is between the two laser points to indicate this to the user method is described by which precise registration of visible image data and thermal infrared data from separate apertures of an imaging device is enabled using only existing components in the typical system containing both visible cameras and thermal infrared sensors The disclosed device makes use of three components already incorporated in many thermal infrared inspection tools 1 the thermal infrared sensor whether single point or imaging array to provide a thermal image of a scene 2 the laser pointer which indi cates roughly the center of the scene being measured using the thermal infrared sensor and 3 a visible camera typically used to provide a corresponding visible and there fore easily interpreted image of the scene and sometimes to provide the operator a visible frame of reference in real time The disclosed device operates by Imaging an object using a thermal infrared sensor Generating radiation light using
13. er o 5 20 25 30 40 45 50 12 a laser operative to emit radiation within the second wave length band and illuminating a reflective object within the second sensor imaging field to generate reflective radiation the reflected radiation being received by the second sensor the laser position and direction of propa gation of the laser radiation being of known spatial reg istration with respect to the second sensor and an image processor operative to 1 receive the first and second sensor output signals 2 extract from the second sensor output the position ofthe illuminated area within the second sensor imaging field 3 calculate from the position and known registration of the laser and second sensor the distance to the reflective object 4 calculate from the distance and the spatial registration of the first and second sensor a registration offset 5 using the registration offset to register the first and second imaging fields 2 The imaging device of claim 1 wherein the first sensor is an infrared point thermometer 3 The imaging device of claim 1 wherein the first sensor is a two dimensional thermal sensor 4 The imaging device of claim 1 wherein the second sensor output is comprised of a time succession of image frames for display 5 The imaging device of claim 4 wherein the laser illumi nation is modulated 6 The imaging device of claim 5 wherein the display ofthe reflective obje
14. he thermal infrared data and can be warned if any temperatures are out of limit or trending towards a limit At 84 the data from the walk through are uploaded to the network based system for trending more detailed analysis of unusual readings analysis by human experts where needed and data archiving Such a network based system could additionally make the data available in convenient centralized form to the user technician or other parties FIG 10 shows an example of a template built based on reference thermal infrared imaging data e g in an electrical equipment predictive maintenance scenario Regions of interest ROIs R1 and R2 are selected because they are not part of the electrical elements being inspected but should reflect ambient temperature conditions in the plant First R1 and R2 are designated based on the thermal image or based ona combination of thermal and visible image data Then the user expert or expert system estimates the emissivity of the surfaces at R1 and R2 based on the type of material and surface finish apparent in the visible image Then areas 1 4 corresponding to four active electrical elements of interest are designated in the image and surface emissivity is estimated for these areas R1 and R2 are designated as ambi ent references for 1 4 This means that during subse quent inspection the average emissivity corrected tempera ture indicated by R1 and R2 will be subtracted from emi
15. ing by time in a system where the laser source is modulated Once the x y location of the laser light in the visible image is determined the image processor using generally known geo metric equations calculates an estimate of the distance to the object 111 and x and y offsets which are used to register the visible and thermal images The geometric equations may include certain simplifying assumptions but in general make use of the following parameters of the system the spatial locations of the laser pointer 101 thermal imaging camera 102 and visible imaging camera 103 relative to each other the optical characteristics ofthe thermal imaging camera 102 and visible imaging camera 103 e g focal length and instan taneous field of view and the bore sight angles of the laser pointer 101 thermal imaging camera 102 and visible imag ing camera 103 relative to each other A hybrid thermal visible image processing unit 109 accepts thermal image information from thermal camera 102 visible image information from visible camera 103 and x and y offset numbers based on object distance from the image processor 108 The x and y offsets are applied to shift the visible or thermal images digitally to provide registration between the images assumed in this case to be scaled appro priately scaling and other corrections could also be applied according to the calculated object distance The resulting registered thermal and visible images or possibl
16. ing device 10 by a user the processing unit 22 produces a composite image which is transmitted to a display 26 The composite image superimposes or otherwise blends the ref erence edge image with real time image and or thermal data coming from the infrared sensor 12 and visible imaging cam era 16 The information displayed may include but is not limited to Superposition of the reference edge image on a live visible image being produced by the visible imaging camera 16 example described below Superposition of the reference edge image on an edge enhanced version ofthe live visible image being produced by the visible imaging camera Superposition of the reference edge image on a blended visible and thermal image Visible indications of goodness of match between a live edge enhanced image and the reference edge image in order to guide the user to the correct orientation of the imaging device 10 versus the object of interest audible indications may be provided as well and Visible indication for example in the form of visible arrows on the screen of a direction the user should move or rotate the imaging device 10 to re create the conditions ofthe reference data capture During use once the user has oriented the imaging device 10 to satisfaction or to a point where an automated indicator as described above reaches an acceptable level the user presses a button or trigger to capture a thermal infrared read ing or alternatively
17. istration in a user transparent focus freemanner and in a manner which is applicable to a system without mechanical adjustments where registration is per formed purely using digital processing means FIG 12 is a block diagram of the device The system is a hybrid thermal visible camera consisting of a laser pointer 101 thermal imaging camera 102 and visible imaging cam era 103 that are packaged together and have center optical axes of 104 105 106 respectively axes may meet at a common point 107 at a known distance although this is optional as long as the separation of spatial locations of the laser pointer thermal camera and visible camera and the angular directions of the three optical axes are known When an object 111 is in front of the hybrid camera light from the laser pointer 101 is reflected offthe object 111 into the visible camera along the axis 112 The visible camera perceives by location in the visible image this light to emanate from a source at an angle 113 from its center axis in this example if the object were located at the sweet spot 107 then that angle would become zero degrees The visible image recorded by the visible camera 103 is passed to an image processor 108 which locates the reflected laser light with a combination of techniques which may US 8 374 438 11 include finding the brightest spot along the known axis where the laser light will appear filtering by color and filter
18. ive video image from the visible camera so as to facilitate highly repeatable alignment of the thermal infrared sensor to an object being inspected 14 Claims 8 Drawing Sheets LASER POINTER 101 gt THERMAL VISIBLE A U S Patent Feb 12 2013 Sheet 1 of 8 US 8 374 438 B1 IMAGING DEVICE 10 THERMAL IR SENSOR 12 2 DISPLAY 28 PROCESSING UNIT 22 VISIBLE IMAGING CAMERA 16 an o s lt lt lt x M ACQUIRE REFERENCE THERMAL READING 28 ACQUIRE REFERENCE VISIBLE IMAGE 32 REFERENCE STORED REFERENCE THERMAL DATA 30 VISIBLE IMAGE 36 Fig 2 U S Patent Feb 12 2013 Sheet 2 of 8 US 8 374 438 B1 ACQUIRE REAL TIME VISIBLE IMAGE 38 PROCESS FOR EDGES DISPLAY REAL TIME REF IMAGES 42 lb STORED REF EDGE IMAGE 36 SER PRESSED ACQUIRE 44 YES ACQUIRE NEW THERMAL READING 46 COMPUTE DIFFERENCE NEW THERMAL READING REF 48 DISPLAY COMPUTED DIFFERENCE 50 Fig 3 U S Patent Feb 12 2013 Sheet 3 of 8 US 8 374 438 B1 Fig 4 a U S Patent Feb 12 2013 Sheet 4 of 8 US 8 374 438 B1 U S Patent Feb 12 2013 Sheet 5 of 8 US 8 374 438 B1 U S Patent Feb 12 2013 ACOUIRE THERMAL ON HANDHELD DEV 68 TRANSFER REF
19. laid on a real time acquired image of the circuit panel In this composite image there is imperfect alignment indicating that the current location and orientation of the imaging device 10 is not the same as at the time of capturing the reference image 32 and that therefore adjustment of the location and orientation are desirable to bring about better alignment FIG 7 shows the stored reference image superimposed on a real time acquired thermal image in the case of good alignment FIG 8 shows a system for accurate measurements over time or over different objects based on the imaging device 10 described above The imaging device 10 acquires reference thermal infrared data which is then downloaded via a wired or wireless data link 54 to a workstation 56 The workstation 56 may store the reference thermal infrared image s the edge processed reference visible image s and possibly the unprocessed reference visible image s from one or more scenes surveyed by the imaging device 10 The workstation 56 may be used by an expert and or expert system software to set up parameters for future inspections of the same object including estimated object thermal emissivities and ambient temperature reference points which may be read in different region of interest in within the same thermal infrared image in the case of a device equipped with a thermal infrared sensor or a separate targeted infrared reading in the case point thermal infrared senso
20. nd tool holding style In accordance with the present invention a system is described by which precise alignment may be achieved between successive thermal infrared measurements of an object of interest or of several identical objects which enables rapid comparison to baseline data trending of data and better real time on site interpretation even by non ex perts of thermal data so that the resulting information can immediately be acted upon The system generally includes the following 1 Integration of an imaging camera e g visible light or near infrared into a thermal infrared imaging device and registration of the imaging camera to a thermal infrared sensor in the imaging device 2 Capture of a baseline image from the imaging camera simultaneously with acquisition of baseline thermal infrared data which may correspond to a known good condition or part for example 3 Automatic generation of an edge version ofthis base line image using one of many well known methods of generating edge images for use as an alignment tem plate and 4 On subsequent thermal infrared inspections superposi tion of the alignment template on a live video image from the imaging camera so as to facilitate highly repeatable alignment of the thermal infrared sensor to the object of interest in orderto facilitate direct compari son between the baseline thermal infrared data and newly acquired thermal infrared data system may o
21. ng device 10 is used to monitor moisture 100 in drywall within a structure The mode of use is as follows An initial reference survey of the building is made at the start of moisture remediation operations One or more moisture free reference locations e g R1 R2 are identified In addition the imaging device 10 may capture air temperature and relative humidity Drying 20 25 30 35 40 45 50 55 60 65 8 operations are commenced On subsequent inspections the user re aligns the imaging device 10 to the same position and orientation as the reference inspection and captures another thermal image The thermal image obtained is corrected using the temperatures ofthe reference points R1 R2 and compen sation can also be made for relative humidity The output image indicates progress of drying in the structure Other building related applications that may benefit from the disclosed embodiments include the following device or system to locate pipe breaks under concrete slab flooring Plumbing or radiant heating pipes which break under slab flooring are a significant problem and the breaks are often difficult to locate Using the disclosed device sys tem the user may capture reference images of flooring then flow hot water into the piping and return after a specified amount of time to re image the flooring from the same posi tion and angle A differential thermal image can be presented immediately on the de
22. onal computer PC workstation At step 72 the inspection parameters for the scene are set up on the workstation These parameters may include the definitions of regions of interest ROIs within a thermal infrared image surface emissivity corrections for those ROIs the establish ment of one or more of the ROIs as ambient temperature reference points and upper and or lower corrected relative temperature limits At step 74 these parameters are trans ferred to the imaging device 10 to enable real time feedback to the user in the field i e subsequent inspections taken from the same position and orientation of the device 10 are processed as set by the parameters and the user is given good no good or other relevant information about the object As shown at 76 and 78 the inspection parameters may also be US 8 374 438 7 set up using a network based system which may consist of expert systems large data libraries and experts in thermo graphic analysis and or the objects of interest Using such a system a factory technician could walk through a facility survey all critical electrical and mechanical equipment sim ply connect the handheld device to a network interface and have all the scenes remotely analyzed parameterized and have inspection parameters loaded into the device As shown at 80 82 on subsequent inspections the technician re aligns the imaging device 10 based on the images from the visible camera 16 captures t
23. present a single point taken by a spot thermometer or a two dimensional thermal image from a thermal imaging sensor is acquired at 28 and stored as stored reference ther mal data 30 Simultaneously a reference visible image is captured at 32 which uniquely identifies the position and orientation of the imaging device 10 when the reference ther mal data 30 was captured At 34 the reference visible image is run through an edge extracting filter as described above and the resulting edge image which may be a binary image although not necessarily is stored as a stored reference vis ible image 36 in association with the stored reference thermal infrared data 30 Optionally if there are insufficient edge features within the visible image which could result in insufficient positional information the imaging device 10 may warn the user and or automatically adjust settings of the visible image camera 16 including flash torch settings for example to obtain a better quality image In this mode the imaging device 10 may optimize the settings of the visible image camera 16 specifically to produce high contrast edges rather than an esthetically pleasing visible image Option ally an unprocessed visible image may be stored as well to provide future reference to human operators FIG 3 illustrates an example of the operation ofthe device to take subsequent thermal infrared readings from the identi cal position and orientation When the user prom
24. ptionally include the following 5 Visual or audible feedback as to the goodness of align ment based on comparison of the stored alignment template with a visible edge image generated in real time 6 On board thermal infrared analysis enabled by the use of this template alignment system including but not lim ited to a Generation of differential thermal infrared data which shows a comparison of the newly acquired thermal infrared data with the baseline thermal infra red data for rapid determinations of deviations in tem perature or temperature distribution on the object of interest b If used with a thermal infrared imaging sensor deter mination oftemperature within pre set spatial regions of interest corresponding to critical points on the US 8 374 438 3 object of interest and operations such as subtraction to examine gradients or averaging 1 These regions of interest and operations may be set up based on the baseline and baseline template either within the thermal infrared imaging device or using off line software If used with thermal infrared imaging sensor com pensation for emissivity on a region by region basis to produce and display an emissivity corrected image in real time 1 Emissivity in each region may be set with the help of the raw baseline visible image using off line software which allows the user to paint varying emissivities using knowledge ofthe material prop erties
25. pts the imag ing device 10 through a button press or similar input that they wish to inspect the object in question the imaging device 10 commences visible video acquisition step 38 the images are in this case processed in real time to enhance edges step 40 and the processed real time video is shown with the reference visible image 36 superimposed on it step 42 giving the user feedback on the current position and orienta tion ofthe imaging device 10 versus the reference data point Once the user determines that the match is sufficient he she prompts the device 10 to acquire the thermal infrared data steps 44 46 In this example the system may then compute differentials between the just acquired thermal infrared data and thereference thermal infrared data to complete the opera tion step 48 and the computed differentials may be dis played step 50 FIGS 4 a 7 show example images from the processes of FIGS 2 3 FIG 4 a shows a reference visible image 32 in this case of an electrical panel with heat generating circuit breakers FIG 4 5 shows a corresponding thermal infrared image 52 FIG 5 shows a stored reference visible image 36 20 25 30 35 40 45 50 55 60 65 6 obtained by edge processing the image 32 of FIG 4 a FIG 6 illustrates the simultaneous displaying of real time and stored reference images of step 42 of FIG 3 the edges of the reference image 36 being shown in white over
26. r In addition for an imaging device 10 with an imaging thermal infrared sensor 12 mul tiple regions of interest may be set up within each scene The workstation may upload the information through a wired or wireless link 58 and a network 60 for storage processing and other services Such a system may include the ability to transmit the information via a network link 62 to an expert s workstation 64 The expert s workstation 64 may be used by a trained thermal infrared expert and or an expert on the objects scenarios being surveyed by the imaging device 10 to set up template parameters for future inspections or to review readings from the imaging device 10 in the field where the extracted temperature limits were exceeded This network based system enables a range of services and capabilities depending on the ability of the imaging device 10 to capture repeatable images for time to time comparisons of the same object or object to object differentials Optionally reference and real time thermal infrared and visible image data may be transferred directly from the imaging device 10 via a wired or wireless link 66 to the network 60 FIG 9 shows a flow diagram of a process for establishing reference or baseline data and parameters and subsequent inspection of objects using a system such as that of FIG 8 In step 68 reference thermal data is acquired on the imaging device 10 and at step 70 the reference thermal data 1s trans ferred to a pers
27. r failing com ponents In many cases thermographic inspections are done regu larly on electrical and mechanical equipment within a build ing or plant The resulting data is reviewed for obvious prob lems hot spots which indicate imminent failure In addition the data may be compared to an established baseline or trended over time to look for early warning signs Such trend based results may enable changes which prevent a failure altogether or allow changes at the next scheduled mainte nance In other cases many different items of the same or similar type are thermographically screened over time as might be the case with electrical mechanical equipment production engine maintenance in fleets or field service of heavy equip ment In this case again obvious hot spots may be easily identified but more subtle anomalies must be identified with baseline data from a known good product or using trend data from repetitive visits to the equipment in question Some companies offer thermal infrared inspection tools which include visible cameras For instance the Fluke 576 data logging infrared spot thermometer is identical to the Fluke 574 data logging spot thermometer except for the addi tion of a visible camera for an additional 700 or more at retail Both of these instruments are suitable for repeated inspection of equipment within a plant or of many identical pieces of equipment hence the data logging function In addition
28. rily to scale emphasis instead being placed upon illustrating the principles of various embodiments of the invention FIG 1 is a block diagram of an imaging device FIG 2 is a flow diagram ofa method of acquiring reference thermal and visible images FIG 3 is a flow diagram of a method of utilizing a stored reference image and acquired images to compare reference and new thermal infrared images FIG 4 a is a reference image of an example object FIG 4 5 is a reference thermal infrared image of an example object FIG 5 is an edge processed version of the image of FIG 4 a FIG 6 is a composite of an acquired visible image of an example object overlaid with an edge processed reference image FIG 7 is a composite of an acquired thermal infrared image of an example object overlaid with an edge processed refer ence visible image FIG 8 is a block diagram of an image processing system employing an imaging device such as shown in FIG 1 FIG 9 is a flow diagram illustrating certain operations of the image processing system of FIG 8 5 20 35 40 45 55 60 4 FIG 10 is atemplate image identifying reference areas and areas of interest for images to be captured in the system of FIG 9 FIG 11 is an image of a building inspection application of the imaging device of FIG 1 FIG 12 is a block diagram of a system for performing alignment of thermal and visible images of a scene DETAILED DESCRIPTION
29. s been found that integrating visible imaging sensors with thermal infrared sensors can be useful to provide the operator with a visible frame of refer ence and in particular for documenting problems and provid ing a visible image for reporting purposes A general problem when combining thermal infrared sen sor data with visible imagery is the spatial registration of this data The optics used for thermal infrared radiation and optics used for visible image capture are generally incompatible It is not generally feasible in low cost systems in particular to have the visible image sensor co aligned along the same axis with the thermal infrared sensor such arrangement gener ally requires specialized optics or becomes very limited in capability As a result visible imagers and thermal infrared sensors are generally placed in close proximity with different apertures and then aimed to have good registration at some pre set distance similar issue exists for another component widely pack aged with thermal infrared sensors in tools the laser pointer Again arranging the laser pointer to be emitted along the identical axis as the thermal infrared sensor is often imprac tical because of the very different wavelengths involved In the vast majority of tools the laser aperture is placed near the thermal infrared sensor aperture As a result the accuracy of US 8 374 438 9 the laser pointer spot in terms of indicating wher
30. ssivity corrected temperatures for 1 4 in order to calculate the temperature differences between the areas A1 A4 and ambient temperature Rules may be established by which an out of range condition may be detected For electrical equipment these rules might include maximum differential from ambient for elements 1 4 If the reference thermal infrared data was taken at a pre determined condition e g electrical power loading maximum tempera ture deviations from that reference condition may also be established A similar application of the present invention is to the field servicing of a fleet of largely identical equipment Examples include diesel engines in generator or marine applications transformers power electronics and heating ventilation air conditioning equipment In this case a reference visible edge image along with reference thermal infrared data images points is generated by the equipment originator or service organization and inspection parameters are generated Field technicians align handheld imaging devices 10 to the same position and angle as the reference and capture the image Differentials are calculated and problems can be flagged in real time based on the parameters allowing for rapid repair and saving an additional trip that would be necessitated if the data had to be analyzed remotely FIG 11 illustrates an application ofthe present invention to building inspection In this example the imagi
31. vice which indicates the location ofthe pipe break with a warmer area A device or system to locate leaks in a building envelope The user surveys the interior of a building or home building a series of reference thermal images A temperature differ ence between the interior and exterior is either naturally occurring or may be induced using heating or air conditioning before referencing A blower door on one or more doors or windows is activated in order to create a negative relative pressure in the building After some time allowed to for cool or hot air from the outside to leak into the structure the user repeats the survey of the interior aligning the device to ref erence images A differential is generated on the spot to indicate leaks in the structure Very similarly to the envelope leak detection system leaks in heating or cooling ductwork often a significant source of energy loss in homes may be detecting using before and after images of ducts vents and ceilings walls with these ducts behind them Again the ability to accurately align ref erence and real time images is critical to obtaining accurate results Thermal Visual Alignment in an Imaging Device Handheld thermal infrared sensors are used extensively to measure object surface temperature for applications such as heat leak finding in structures or industrial systems and test ing electrical or mechanical equipment for failures or immi nent failures Increasingly it ha
32. w abandoned 700372008 60 Provisional application No 60 977 472 filed on Oct cited by examiner ns aper E application No 61 027 616 filed Primary Examiner Sheela Chawan E 74 Attorney Agent or Firm BainwoodHuang 51 Ine CT 57 ABSTRACT G06K 9 00 2006 01 HOAN 5 33 2006 01 An imaging device and system include integration of an 25 00 2006 01 imaging camera visible light near infrared with a ther 1 01 2006 01 mal infrared sensor capturing a baseline image from this 52 U S Cl 382 209 382 100 382 106 430 964 camera simultaneously with acquisition of baseline thermal AS 348 E5 09 250 332 250 330 infrared data which may correspond to a known good con 58 Field of Classification Search 382 209 dition or part automatic generation of an edge version of the 382 100 115 118 128 117 103 106 250 332 250 334 342 330 338 1 348 164 5 09 348 E3 01 166 E5 081 263 239 167 168 340 522 587 632 577 628 374 124 100 374 120 E13 001 E13 002 E13 003 121 374 130 430 201 964 944 339 522 517 i i DISPLAY 110 le 4 P EUR 2 HYBRID IMAGE PROCESSOR 5 I IMAGE PROCESSOR f 108 77i CAMERA 102 baseline image for use as an alignment template and on subsequent thermal infrared inspections superposition ofthe alignment template on a l
33. y a combi nation are then optionally output to a display 110 In other cases the resulting imagery could be further processed stored or transmitted to a remote location Variations on this basic system are possible including implementations where the laser is modulated in a specific timing relative to the visible camera frame rate so that the laser reflection may be more accurately extracted from the overall scene indicated by the dotted control lines between the registration processor 108 the laser pointer 101 and the visible camera 103 While various embodiments of the invention have been particularly shown and described it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims What is claimed is 1 An imaging device comprising a first sensor operative to receive first sensor input in an infrared wavelength band from a first sensor imaging field and to generate a corresponding first sensor output signal a second sensor operative to receive second sensor input in a second wavelength band from a second sensor imaging field and to generate a corresponding second sensor output signal the second sensor imaging field contain ing or being larger in extent than the first sensor imaging field the first and second imaging fields being of known spatial registration with respect to each oth
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