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User Guide - CIM Net A/S

1. New User a taal Showing 1 to 1 of 1 users Enabled Username Name Last sign in Created G Yes admin Administrator 2013 04 29 19 35 59 2013 04 19 Page 51 of 69 CPT User Guide CIM Electronics 6 1 1 1 Add new user To add a new user click the New User button on the Users page Fill out the fields on the page and click Save CIM SPC Dashboard Reports System Administrator system Users New User Enabled Username CIM test enduser Name TestUser Description Tester Email address tester noemail com Password Confirm password Security groups Users x In order to get access to the system the user must be enabled and be assigned one or more security groups Page 52 of 69 CPT User Guide CIM Electronics 6 1 1 2 Edit user To edit an existing user click the edit icon in the user list CIM SPC BEEE Reports System Administrator System Users Edit User admin Enabled Username admin Name Administrator Description Email address f j Password Confirm password Security groups Administrators x When finished editing user settings click Save to store changes 6 1 2 Security Groups Security groups control which pages and items a user is allowed to access CIM SPC Dashboard Reports System Administrator System Security Groups New Security Group Q 1 Showing 1 to 2 of 2 groups Name Descriptio
2. Additional help for each parameter is displayed when moving the mouse pointer over the question mark to the right of each parameter field Page 60 of 69 IM Electroni CPT User Guide CIM Electronics 6 3 1 4 Creating a new MS Access import task To setup the necessary parameters for importing test data from a Microsoft Access database the button New MS Access Import Task should be clicked Administrator CIM SPC Dashboard Reports System System Import Tasks New MS Access Import Task a GENERAL Enabled Yes No Name Enter a name Description 4 Max test results per unit 25 D DEFAULTS ltem number Test name 2 Test station K2 Test fixture MICROSOFT ACCESS Reader Select a reader L 2 Database file path All necessary parameters should be filled out before saving and enabling the new MS Access importer task Additional help for each parameter is displayed when moving the mouse pointer over the question mark to the right of each parameter field Page 61 of 69 CPT User Guide CIM Electronics 6 3 2 Import Task Monitor This screen is used to investigate the status and error log of the enabled data importers It contains relevant information and performance indicators to provide an overview to the health of the data import into the system The information in the screen is automatically updated every 10 seconds CIM SPC Dashboard Reports System Administrator System Import Task Monitor
3. System Item Groups s New Item Group Q 1 Showing 1 to 1 of 1 groups Name Description Special customer Only allowed to see car display 6 2 2 1 Add item groups To add a new item group click the New Item Group on the Item Groups page Fill in the fields on the page and click Save Page 56 of 69 CPT User Guide CIM Electronics CIM SPC Dashboard Reports System Administrator System ltem Groups New Item Group Name Car items Description Items that belongs to cars Items CIM003 Car display x 6 2 2 2 Edit item groups To edit an existing item group click the edit icon inthe Item Group list CIM SPC BEC ce Reports System Administrator p y System ltem Groups New Item Group Name Car items Description Items that belongs to cars Items CIM003 Car display Save stores the changes to the item group 6 3 Importer 6 3 1 Import Tasks By default the SPC system supports TestStand XML format Additional import readers can be implemented to support the specific customer needs and business models In general test data imports originates either from files like TestStand XML CSV files etc or from some different kinds of databases like MySQL MS Access MS SQL etc Additional import read can be implemented for both new file formats and data stored in databases CIM SPC BET lees ice Reports System Administrator Syste
4. CIM Electronics connecting technologies CPT User Guide CIM Electronics connecting technologies CPT User Guide Table of Contents De SIRE WW i E E E E AE A EE A E A AE 4 PIV E E E T A E E E EE EA T E E E 5 2L MEn LENS eo a TE E roeee oon ane ermnarneaeere eaves 5 3 PENDON ee E E A 6 BS OS a arte cp E E A es ements 7 Al Navede MD Ate Er O EE EE 7 A NVE e ECN e E E E 9 ae A M O E E 1 6 ee AEE IE A E EEE EE E E AA T 9 42 2 Normaldistribution thar ecsssisesanin a RRG 10 ALa LOOM ra R E 10 AS PHONE TEDO ee E E caeunecaneateceioacnnens 11 AL EOT O PDP ea E E A A 11 A EX OTO EOE E E E A E 11 AA IPP WO GINS repor S ea E T ae 11 Aa SPE TEOT orie a E E E E E 12 Ao TMe Seres tTenO Een unui aunincen que munienmacrneneianans 14 WT TOERE UNTO NO ee dene ss ccna cena pena eeesaciseenescsseyannsseedenes osuscee nysmcncedreneaoesendeousnenceses deus 16 4S WHIT IOVEIVICW TEDO oein inte credaniminreosnege ert enespreebcmieiect 17 A TETU TEDO Cat en ne en eee eee on Rn en ee ee eee ee 19 ll Ol Esc fats ym 6 Mg 016 Seamer seen ae ra ere ee ae 21 4 11 Test Step Error Pareto report ccccssccsscsccssccsecsscesecascesecscesecascesecascesecascesecaseesecasetseees 23 4 12 Test Duration repOft ssesssssessesserseseeseesesresresrosresrosnesereresrrsnesrrsrrorssrsorsorrsnrorsesseaseesessesseesens 24 4 13 Test Step Duration report cccsscssscssscrsscescccscsesssessssseesceeeseceseceseceseesseesseeeseees
5. Page 27 of 69 connecting technologies CPT User Guide CIM Electronics Report time Included in Included in 2012 03 28 10 00 00 Range Window Available in the following report s Report Default filter Advanced filter SPC X 5 3 Items Limits data so that it only includes data concerning the selected items By default all items are selected however this is an inter related field see section 5 1 so a selection in one of the other related fields will influence the available contents of the Items field To select an item to include set focus onto the Items field by clicking it with the mouse A list of all available items is shown Select an item to include by clicking it tems CIM001 Universal mainboard CIMO02 Enterprise mainboard CIMO03 Car display To select more items simply select another item by clicking it Items CIMO001 Universal mainboard CIMO002 Enterpnse mainboard CIMO003 Car display Page 28 of 69 IM Electroni CPT User Guide CIM Electronics To search for a specific item simply type any part of the item number or description text Items CIMO01 Universal mainboard ca Remark If specific Test s are selected the available items are limited to items related to the selected test s Available items can also be limited by assigned user rights Available
6. selected Available in the following report s Report Default filter Advanced filter SPC e eee TimeSeries Jo XxX o Test Result Test Yield Test Step Yield Test Step Error Pareto Test Duration Test Step Duration Page 35 of 69 IM Electroni CPT User Guide CIM Electronics 5 9 Test step cycle Limits data so that it only includes data with the selected test step cycle parameter Test step cycle is defined by how many times an individual test step has reported a result in the same test report Test step cycle Last test step cycle Alltest step cycles First test step cycle Last test step cycle Parameters All test step cycles Includes all test step cycles in selected data First test step cycle Only the first test step cycle is selected Last test step cycle Only the last test step cycle is selected Available in the following report s Report Default filter Advanced filter SPC OO X o Time Series XX o Test Step Yield Ee Test Step Error Pareto ee Test Step Duration ee Page 36 of 69 CPT User Guide CIM Electronics 5 10 Test stations Limits data so that it only includes data from the selected test station s By default all items are selected however this is an inter related field see section 5 1 so a selection in one of the other related fields will influence the available contents of the Test stations field To select a test station to include set focus onto the Test stations fiel
7. 016 E 00 A DAAAAAAAAAAMAAM AA AMAA A ACAABAMMAAAM OAA AAAA 0 015 E 00 A AMAA NO A QA AMAA A AAAA AAA MOANA 0 014 E 00 2012 03 01 00 00 2012 05 01 00 00 2012 07 01 00 00 2012 09 01 00 00 2012 11 01 00 00 2013 01 01 00 00 2013 03 01 00 00 Meaning of circle and triangle Circles represent a single measurement triangles represent a group of measurements Tooltip By moving the mouse curser over either a circle or a triangle detailed information appears Tooltip circle Timestamp 2013 06 13 23 22 10 tem CIN001 Universal mainboard Seral no 5N635067625308065750 Measurement 45 049 E 00 WOC If the mouse is clicked on a circle the report Unit Overview is shown with filter options filled out corresponding to the selected unit Tooltip triangle Measurement 48 973 E 00 to 48 879 E 00 i Page 9 of 69 IM Electroni CPT User Guide CIM Electronics 4 2 2 Normal distribution chart Distribution Chart Q Xaxis Yaxis Both axes Reset E Actual distribution E Norma distribution E 3c E Mean E c E Min USL E Max LSL 2 800 E 00 2 500 E 00 2 400 E 00 2 300 E 00 2 200 E 00 2 100 E 00 2 000 E 00 1 900 E 00 1 800 E 00 1 700 E 00 1 600 E 00 1 500 E 00 1 400 E 00 Each bars represent a percentage of measurements Hold the mouse over a bar to see a tooltip with detailed information 1 6 of the measurements HOD 0 017 EXO 0 018 E 00 4 2 3 Zoom The zoom mode is controlled
8. 5 Tests Limits data so that it only includes data concerning the selected tests By default all tests are selected To select a test to include set focus onto the Test field by clicking it with the mouse A list of all available tests is shown Select a test to include by clicking it Tests Car display test CIM Mainboard CIM mainboard test 1 CIM mainboard upload no numeric measurements Mainboard 1 Mainboard 2 Mainboard function test Mainboard software upload Mainboard test 1 To select more tests simply select another test by clicking it Tests Car display test x CIM mainboard test 1 x CIM Mainboard E CIM mainboard upload no numeric measurements Mainboard 1 Mainboard 2 Mainboard function test Mainboard software upload Mainboard test 1 Mainboard upload 1 Mainboard upload 2 Page 31 of 69 IM Electroni CPT User Guide CIM Electronics To search for a specific test simply type any part of the test name Tests Mainboard 1 uploa CIM mainboard upload no numenc measurements Mainboard software upload Mainboard upload 1 Mainboard upload 2 Remark If specific Item s are selected the available tests are limited to tests related to the selected item s Available tests can also be limited by assigned user rights Available in the following report s Report Default filter Advanced filter Test Result Test Yield Test Step Yield Test Step Error Paret
9. User Management Provides access to management of users and security groups Data Management Provides access to management of item groups etc Import Tasks Provides access to configuration of Import Tasks Page 54 of 69 IM Electronics CPT User Guide CIM El technologies 6 1 2 2 Edit security group To edit an existing security group click the edit icon inthe security group list CIM SPC Dashboard Reports System Administrator System Security Groups Edit Security Group Users Name Users Description Default user group with access to all reports full item access Users Select some users Accessible item groups Select some item groups Allowed permissions E Administrator Provides full access to all features and all Items Access to all Items Provides access to all Items in the system Dashboard Provides access to the Dashboard SPC Report Provides access to the SPC Report Time Series Report Provides access to the Time Series Report Unit Overview Report Provides access to the Unit Overview Report Test Yield Report Provides access to the Test Yield Report Test Step Yield Report Provides access to the Test Step Yield Report Test Step Error Pareto Report Provides access to the Test Step Error Pareto Report Test Duration Report Provides access to the Test Duration Report Test Step Duration Report Provides access to the Test Step Duration Report El User Mana
10. by the buttons X axis Y axis and Both axes Xaxis Yaxis Both axes Reset X axis Zoom in only on X axis Y axis Zoom in only on Y axis Both axes Zoom in by selection rectangle To reset zoom level back to the initial level press reset button or double click the graph Page 10 of 69 IM Electronics CPT User Guide CIM El technologies 4 3 Exporting reports Most reports can be exported to Microsoft Excel and Adobe PDF 4 3 1 Export to PDF This report type exports all the result data including graphs filter settings etc To export to PDF select menu item Export and then Report to PDF The report is generated on the server and presented as a download file 4 3 2 Export to Excel This report type exports all the result data for the report Filter selection is presented on the first page and the data on second page To export to Excel select menu item Export and then Report to Excel The report is generated on the server and presented as a download file 4 4 Filtering reports All reports are made based on test data selected with filter Each report has a set of default filter options and some additional advanced filter options Default Advanced By clicking the Default button all default filtering options are visible Clicking the Advanced button makes further filter options available for the selected report Whenever possible the selected filtering options are tr
11. entries Test Teststep Cpk Cpk USL Cpk LSL Mean o Min USL Max LSL Measurements Car display test Analog 1 0 754 3 535 0 754 730 E 03 544 089 E 06 21 500 E 03 14 500 E 03 9 301 Car display test Analog 2 6 094 9 768 316 E 03 420 270 E 00 110 000 E 03 90 000 E 03 9 301 Car display test Analog 3 30 652 7 468 30 652 12 311 E 03 1 076 E 06 121 000 E 06 99 000 E 06 9 301 Car display test Analog 4 5 567 567 7 478 645 E 00 8 944 E 00 175 000 E 00 175 000 E 00 9 301 If a table contains more rows than defined by a user setting the paging control is enabled To navigate through the pages click arrow icons or page number directly 1 2 2 Showing 1 to 10 of 12 entries The sort order of the table can be set to order from high to low or low to high Further the sort order can be controlled by selecting multiple columns headers hold shift key while clicking the headers When multi selecting the sort order is determined by the order the columns is selected Click a column header once to choose low to high sorting and click twice to select high to low sorting Page 8 of 69 IM Electroni CPT User Guide CIM Electronics 4 2 Navigating in charts In reports containing graphs the following navigation can be used 4 2 1 XY chart b Series Chart Q xXaxis Yaxis Both axes 0 022 E 00 WB Measurement E o 0 021 E 00 E ean E 3c MM USL LsL 0 020 E 00 0 018 E 00 0 017 E 00 AA AM HOMMGA A OO A co A OO o ono 0
12. time is waste and hence loss of production efficiency so all efforts should be made to minimize handling time provided there is a significant production volume to pay for the investment Poor handling time can originate from a number of different sources naming a few e Test fixtures and connectors are too difficult and time consuming to handle e Products undergo transport between tests e Manual handling is too slow Whatever the reason is for the poor handling time it should be properly investigated perhaps as part of a LEAN project to optimize production logistics and maybe even reduce or simplify production steps Like the Test Yield report the Test Duration report can also be used to compare performance as a function of time periods operators test fixtures or shifts Page 24 of 69 CPT User Guide CIM Electronics To get the Test Duration report fill out the appropriate filter options and click the Search button CIM SPC Dashboard Reports System Export Administrator p y Reports Test Duration 2 Test period 2013 06 01 Today 00 00 00 23 59 59 MRange window Default Advanced items CIMQ03 Car display x Tests Test result Passed Test run First test run Time scale Week Q Xais Yaxis Both axes Reset 500 E Average total time E Test count E Test time E Handle time 0 o EEE 2013 04 01 00 00 2013 07 01 00 00 2013 10 01 00 0
13. 0 2014 01 01 00 00 A tooltip with detailed information will appear when holding the mouse pointer on bars in the graph Page 25 of 69 CPT User Guide 4 13 Test Step Duration report Detailed duration information for all test steps in a test Typical use CIM Electronics connecting technologies The Test Step Duration report can be used to get a deeper insight into time it takes for each test step to complete The report provides simple statistics for the time spent for each test step including average duration standard deviation and worst duration As test time is one of the limiting elements for production Capacity efforts should be made to investigate and optimize any test step taking up to majority of time When looking at time spent on test steps it is also very interesting if any of the unnecessary test steps found via the Test Step Yield report is also taking up lots of time when testing In that case much time is spent on completing test steps that hardly ever fail perhaps a serious candidate for optimization To get the Test Step Duration report fill out the appropriate filter options and click the Search button CIM SPC BEUTE Administrator Reports Test Step Duration Test period Items Tests Test result Test run Test step cycle Q Test Mainboard 1 Mainboard 1 Mainboard 1 Mainboard 1 Mainboard 1 Mainboard 1 Mainboard 1 Mainboard 1 Mainboard 1 Mainboar
14. 3 Car display x Tests Test run First test run Test step cycle Last test step cycle Q xais Yaxis Both axes Reset Test Test step 100 p Showing 1 to 10 of 39 test steps Test Test step Total Passed Car display test Test 4 8 638 7 790 Car display test Vision check 1 6 876 6 475 Car display test Keyboard Test 1 148 5 821 Car display test Vision check 569 162 Car display test Keyboard Test 798 494 Car display test Check Display 859 719 Car display test Test 5 568 328 Car display test Test 1 096 819 Car display test Check Display v 0 073 046 Car display test Check Volumepot 1 109 934 PPPPPPPPPP A tooltip with detailed information will appear when holding the mouse pointer on bars in the graph Page 22 of 69 CIM Electronics connecting technologies CPT User Guide 4 11 Test Step Error Pareto report Sorted list of most frequent failed test steps for a selected item Typical use The Test Step Error Pareto report is very similar to the Test Step Yield report and essentially shows the same data The only difference is that it focuses on errors failed tests where the Test Step Yield report focuses on succeeded tests The two reports can be used for the same purposes Please refer to section 4 10 for further description on the use of these reports To get the Test Step Error Pareto report fill out the appropriate filter options and click the Search but
15. 462 E 03 109 271 E 03 31 853 E 00 15 768 E 03 102 455 E 03 136 889 E 03 29 560 E 00 1 000 E 00 1 000 E 00 o 522 145 E 06 408 155 E 00 1 670 E 06 15 651 E 00 622 735 E 06 1 358 E 03 2 012 E 06 12 378 E 00 0 0 Min USL 21 500 E 03 110 000 E 03 121 000 E 06 100 000 E 00 21 500 E 03 110 000 E 03 121 000 E 06 100 000 E 00 1 000 E 00 1 000 E 00 Default Max LSL 14 500 E 03 0 000 E 03 9 000 E 06 100 000 E 00 14 500 E 03 90 000 E 03 99 000 E 06 100 000 E 00 1 000 E 00 1 000 E 00 Advanced Reset Measurements To see measurements in a Time Series report simply click the magnifying glass in the first column of each row This opens the Time Series report with prefilled filter options according to the selected test step Page 13 of 69 CIM Electronics connecting technologies CPT User Guide 4 6 Time Series report Time based XY graph and the normal distribution graph of the measurements for a specific test step Statistical analysis values are shown for the selected measurements Typical use Based on the a filter criteria including a specific test step the Time Series report shows three pieces of information e Calculated Values All calculated statistical values for the given filter criteria These values correspond to the values visible on the SPC report Also visible are additional values corresponding to the mean value minus plus 3 times standard deviation These valu
16. 5228883340568282 SN635228875408068262 SN635228872759787032 SN635228869238068262 The query is limited to 10 000 test results CIM001 CIM001 CIM001 CIM001 CIM001 CIM001 CIM001 CIM001 CIM001 CIM001 Universal mainboard Universal mainboard Universal mainboard Universal mainboard Universal mainboard Universal mainboard Universal mainboard Universal mainboard Universal mainboard Universal mainboard Mainboard 1 CIM mainboard upload no numeric measurements CIM mainboard upload no numeric measurements CIM mainboard upload no numeric measurements CIM mainboard upload no numeric measurements Mainboard 1 Mainboard 1 Mainboard 1 CIM mainboard upload no numeric measurements CIM mainboard upload no numeric measurements 1 of 1 1 of 1 1 of 1 1 of 1 1 of 1 1 of 1 1 of 1 1 of 1 1 of 1 1 of 1 Passed Passed Passed Passed Passed Passed Passed Passed Passed Passed Station 002 Station 014 Station 014 Station 014 Station 014 Station 002 Station 001 Station 001 Station 014 Station 014 Tester 202 0232 33 administrator administrator administrator administrator administrator Tester 202 0232 33 Tester 202 0232 33 administrator administrator 2013 12 17 15 45 15 2013 12 17 15 38 43 2013 12 17 15 11 05 2013 12 17 15 07 04 2013 12 17 14 57 31 2013 12 17 14 50 29 2013 12 17 14 45 58 2013 12 17 14 32 53 2013 12 17 14 28 22 2013 12 17 14 22 51 Page 16 of 69 CPT
17. 69 CPT User Guide 8 Statistical calculations CIM Electronics connecting technologies In the SPC report a number of statistical values are calculated and used for presentation This section shows the formulas used to calculate these values The formulas are shown for reference only Please refer to special articles and literature regarding the practical use and limitations of the calculated values In the formulas below USL and LSL denotes the upper specification limit and the lower specification limit 8 1 Formulas 8 1 1 Mean value X 8 1 3 Capability Cp Ae USL LSL Po 60 8 1 4 Capability Index Cpk USL X CpkUSL gt X LSL CpkLSL Min USL X X LSL pk Min Cp USL Cpe LSL Page 67 of 69 IM Electroni CPT User Guide CIM Electronics 8 2 Special value handling In order to avoid misleading values for any of the capability values Cp Cok Cok USL and Cpk LSL in case of special circumstances in the test data a special error value is used In case any of the mentioned capability values are less than 999 999 or greater than 999 999 the resulting value will be set to 999 999 or 999 999 respectively Page 68 of 69 i CPT User Guide CIM Electronics 9 Revision History Revision Date Initials Description 2013 04 29 First version 2013 05 01 LDI RD Review 2013 05 23 Dashboard minimum number of tests 2013 12 17 RD Updated sc
18. CIM001 Universal mainboard AERAR i iiis CIM002 Enterprise CIM002 Enterprise mambang mainboard CIM001 Universal CIM mainboard upload no numeric mainboard measurements CIM002 Enterprise mainboard Mainboard 1 43 6 Mainboard function test 47 98 Mainboard test 1 406 56 9 Mainboard software upload z 75 8 1 041 6 63 83 CIM001 Universal CIM mainboard upload no numeric mainboard measurements 63 83 Mainboard software upload 1 600 75 88 CIM002 Enterprise ee en 56 98 mainboard CIM002 Enterprise mainboard Mainboard upload 1 79 6 CIM003 Car display CIM002 Enterprise mainboard Car display test Mainboard upload 1 78 7 79 63 pa Data is loaded when page is shown By clicking the button the view is refreshed with the latest data available The number of days and minimum number of tests to take into consideration in this view can be adjusted in the personal settings see section 7 1 Page 6 of 69 CPT User Guide CIM Electronics 4 Reports To enter Report main page click the Reports text in menu line CIM SPC Dashboard Reports System Administrator The page presents the available reports depends on the current user rights CIM SPC Dashboard Reports System Administrator Reports e SPC Test Yield mu Statistical analysis result for test steps represented by mean value standard Numeric details and bar graph of the
19. Export Administrator Reports Test Yield Test period Items Tests Test run Time scale 2013 06 01 Today 00 00 00 23 59 59 Range Window CIM003 Car display x First test run Week Q Xais Yaxis Both axes Reset 1200 0 2013 06 01 00 00 From time 2013 06 10 00 00 00 2013 06 17 00 00 00 2013 06 24 00 00 00 2013 07 01 00 00 00 2013 07 08 00 00 00 2013 07 15 00 00 00 2013 07 22 00 00 00 2013 07 29 00 00 00 2013 08 05 00 00 00 2013 08 12 00 00 00 2013 07 01 00 00 2013 08 01 00 00 Showing 1 to 10 of 28 entries To time 2013 06 16 23 59 59 2013 06 23 23 59 59 2013 06 30 23 59 59 2013 07 07 23 59 59 2013 07 14 23 59 59 2013 07 21 23 59 59 2013 07 28 23 59 59 2013 08 04 23 59 59 2013 08 11 23 59 59 2013 08 18 23 59 59 2013 09 01 00 00 2013 10 01 00 00 2013 11 01 00 00 Failed 111 139 176 193 132 132 Default Advanced WM Passed E Failed E Aborted E Error Yield E Avo yield 78 1 2014 01 01 00 00 Yield 75 8 77 9 75 9 75 7 79 6 80 4 76 4 78 5 77 7 75 8 A tooltip with detailed information will appear when holding the mouse pointer on bars in the graph Remark Selecting an item leaving the filter option Tests at the default value All tests will not give the net production yield for the selected item In order to get the net production yield the last test performed before shipping m
20. M Electronics CPT User Guide connecting technologies Pattern See further descriptions below Pattern Every weekday r Weekly Monthly The Daily pattern is used if the report should be sent out on a daily basis every day or every weekday Pattern Daily Every 1 week s on L Weekly E Monday E Tuesday Wednesday E Thursday E Friday E Saturday E Sunday Monthly The Weekly pattern is used if the report should be sent out on certain days of the week ES Pattern Daily Every 4 gt month s on the first weekday of the month Weekl first day eek d first weekday Monthly last weekday last day The Monthly pattern is used if the report should be sent out on certain days of the month Page 64 of 69 CPT User Guide CIM Electronics 6 4 1 2 Report and Filter CIM SPC Dashboard Reports System Administrator System Scheduled Reports Edit Scheduled Report 2 Settings Recipients and Recurrence Report and Filter Type Test Step Error Pareto Report v Run as user cim o Document type PDF Excel PDF and Excel FILTER Time period 90 days back z Items CIM003 Car display x Tests Test run First test run a Test step cycle Last test step cycle v Test stations General Settings Type The layout of the report to send out Test Yield or Test Step Error Pareto Run as user The user profile to be used when generating the sche
21. Only test time Only handling time Parameters Both test and handling time Shows test time and handling time in selection data result Only test time Shows only test time in selection data result Only handling time Shows only handling time in selection data result Available in the following report s Report Default filter Advanced filter Test Duration o S X 5 22 Handling time cutoff Defines the upper limit of the handling time between two tests If the time between two tests exceeds handling time cutoff the handling time is set to the cutoff value Handling time cut of 00 15 00 Time is entered as hh mm ss hours minutes seconds Available in the following report s Report Default filter Advanced filter Test Duration as E E Page 50 of 69 CPT User Guide CIM Electronics 6 System By selecting System from the menu the follow page is shown CIM SPC Dashboard Reports System Administrator System a USER MANAGEMENT Users Security Groups DATA MANAGEMENT Items ltem Groups SERVICE MANAGEMENT Import Tasks Import Task Monitor Scheduled Reports 6 1 User management Gives access to maintain users and security groups 6 1 1 Users Gives a list of all users in the system Existing users cannot be deleted If access needs to be restricted blocked for a certain user edit the user and uncheck the Enabled check box CIM SPC Dashboard Reports System Administrator system Users
22. Passed 15 000 E 03 Passed Analog 2 99 000 E 36 Failed 102 494 E 03 Passed Analog 3 64 641 E 03 Passed Analog 4 35 800 E 00 Passed oon Dm A WH b o Page 18 of 69 CIM Electronics connecting technologies CPT User Guide 4 9 Test Yield report Numeric details and bar graph of the yield for a number of selected tests Each bar in the graph shows the passed failed relation of the performed tests Typical use The Test Yield report is typically used get an overview of the actual yield and percentage yield for tests performed on a given product or product group Normally all attention should be focused on maximizing first pass yield as any subsequent tests will add cost to the product and hence lower production efficiency So comparing first pass yield with last pass yield gives a tangible indication of production inefficiency and added costs Of course when looking at yield the production volume is also a key element to determine where to focus any production optimizing efforts in order to get the best payback Another way to use this report is to compare the yield results of different time periods and thereby directly compare the production capability for time periods or different shifts operators etc Page 19 of 69 CPT User Guide CIM Electronics connecting technologies To get the Test Yield report fill out the appropriate filter options and click the Search button CIM SPC Dashboard Reports System
23. User Guide CIM Electronics 4 8 Unit Overview report Test step result and measurements for all performed test runs for a specific item serial number Typical use The Unit Overview report is typically used to get full test reports for specific units In case a unit has been tested more than once the performed tests can be selected and shown side by side This way it is easy to get an overview and compare the results of each test step and any differences in test conditions and parameters The report can also be used as an easy way to get full product test documentation in case the product undergoes repair or the like To get the Unit Overview report fill out the filter options and click the Search button CIM SPC Dashboard Reports System Export Administrator p y p Reports Unit Overview 2 item CIM003 Car display Serial no 10085327 Test Overview Test status Unit has passed test Showing 3 test results Show Test time y Test Testrun Test result Test station Test fixture Test operator Test version Unit revision Import time 2013 08 26 02 32 40 Car display test 3 of 3 Passed Station 013 Virtual Fixture Operator Operator 002 2013 08 26 02 44 40 2012 07 18 05 25 31 Car display test 2 of 3 Passed Station 013 Virtual Fixture Operator Operator 002 2012 07 18 05 37 31 2012 07 18 05 19 04 Car display test 1 of 3 Failed Station 013 Virtual Fixture Operator Operator 002 2012 07 18 05 31 04 b Test Step Results Select o
24. ansferred when switching between different types of reports Clicking the Reset button causes all filtering options to be reset to their initial state and value Page 11 of 69 i IM Electroni CPT User Guide CIM Electronics 4 5 SPC report Statistical analysis result for test steps represented by mean value standard deviation 0 Cp and Cpk index values as well as specification limits For further information on the calculated statistical values please refer to section 8 Typical use The SPC report contains the results of the statistical analysis performed on the data selected by the filter criteria Please notice that the correct use of the SPC report presumes the filtered data is normal distributed and lies within the normal distribution Bell Curve see further explanation in section 4 6 Bell Curve Standard Normal Distribution 0 5 0 1 0 1 Z Score 4 3 5 3 2 5 2 1 5 1 05 0 0 5 1 15 2 25 3 35 4 5 ary lb 40 30 20 10 0 10 20 30 40 l 0 1 2 3 15 9 50 64 1 o7 T 99 9 Cumulative Percent 1 5 10 20 30 40 50 60 70 80 90 95 99 The capability values Cp and Cpk are used to indicate the performance of the production processes involved in generating the selected data Typically these values are used in Six Sigma process optimizations to give a direct indication of a process sigma level and the defects PPM Defect Parts Per Million See estimated conversion table below Cpk va
25. be used p Showing 1 to 10 of 12 entries Test Test step oe Cpk USL Cpk LSL Mean o Min USL Max LSL Measurements Car display test Analog 1 2 144 0 754 3 535 0 754 15 730 E 03 544 089 E 06 21 500 E 03 14 500 E 03 9 301 Car display test Analog 2 7 931 6 094 6 094 9 766 102 316 E 03 420 270 E 00 110 000 E 03 90 000 E 03 9 301 Car display test Analog 3 3 408 30 652 37 468 30 652 72 311 E 03 1 076 E 06 121 000 E 06 99 000 E 06 9 301 Car display test Analog 4 6 522 5 567 5 567 7 478 25 645 E 00 8 944 E 00 175 000 E 00 175 000 E 00 9 301 Car display test Check Volumepot 9 746 8 888 10 603 8 888 1 015 E 03 3 502 E 00 1 126 E 03 921 600 E 00 9 301 Car display test Current measure 4 780 0 494 9 066 0 494 48 620 E 03 2 441 E 03 115 000 E 03 45 000 E 03 9 301 Car display test Keyboard Test 1 000 E 00 0 1 000 E 00 1 000 E 00 9 301 Car display test Profilering 1 000 E 00 0 1 000 E 00 1 000 E 00 9 301 Car display test Serial write 1 000 E 00 0 1 000 E 00 1 000 E 00 9 301 Q Q Q Q Q Q Q Q Q Q Car display test SW update 1 000 E 00 1 000 E 00 1 000 E 00 9 301 Page 7 of 69 CPT User Guide CIM Electronics Text can be searched in columns containing text In the above screenshot the Test and Test step columns can be searched To search simply enter a text in the search field The text can be any part of the texts contained in the searched columns Example of search with ana Q ana 4 Showing 1 to 4 of 4 entries filtered from 12 total
26. cking it Test result Passed 5 All Failed Aborted Error Terminated Parameters All includes all test reports regardless of test result Passed includes only passed test reports Failed includes only failed test reports Aborted includes only aborted test reports Error includes only error test reports Terminated includes only terminated test reports Available in the following report s Report Default filter Advanced filter SPC O XX o Time Series XX o Test Result X ee Test Duration Od Test Step Duration a Page 34 of 69 CPT User Guide CIM Electronics connecting technologies 5 8 Testrun Limits data so that it only includes data with the selected test run parameter Test run is defined by the number of times an individual unit has been tested in the same test I Test run Test run equals All test runs First test run Last test run Test run equals Test run less than Test run greater than Parameters All test runs Include all test runs in selected data First test run Only the first test run is selected Last test run Only the last test run is selected Test run equals Only the test run number specified in the numeric field is selected Test run less than Only test runs less than test run number specified in the numeric field is selected Test run greater than Only test runs greater than test run number specified in the numeric field is
27. d 1 Reports System 2013 06 01 Range Window Mainboard 1 x Passed First test run Last test step cycle Test step MainSequence RX SAW Filter Output MainSequence Step Load MainSequence Buzzer MainSequence Calibration MainSequence Free running Frequencies FFT MainSequence BOM Version MainSequence Display MainSequence Modem TX co channel rejection MainSequence Type in and Validate Type in and Validate Showing 1 to 10 of 976 test steps Worst duration y Oh 57m 45s 354ms Oh 41m 20s 093ms Oh 40m 27s 342ms Oh 27m 11s 535ms Oh 26m 34s amp 26ms Oh 23m 14s 512ms Oh 17m 57s 284ms Oh 11m 12s 181ms Oh 10m 18s 642ms Oh 10m 18s 583ms Average duration Oh 00m 32s 480ms Oh 00m 29s 097ms Oh 00m 38s 263ms Oh 00m 40s 671ms Oh 00m 283 010ms Oh 00m 01s 702ms Oh 00m 35s 658ms Oh 00m 18s 339ms Oh 00m 06s 511ms Oh 00m 283 395ms Export Default Advanced o duration Oh 02m 31s 285ms Oh Olm 23s 444ms Oh 03m 05s 772ms Oh 00m 30s 226ms Oh 00m 31s 617ms Oh 00m 23s 707ms Oh Olm 16s 945ms Oh 00m 29s 182ms Oh 00m 29s 340ms Oh Olm 03s 130ms Count Page 26 of 69 CPT User Guide CIM Electronics 5 Report filters This chapter provides detailed information on the different report filter elements Hint When showing a report based on selected filer criteria you can copy the page link URL and store or send to a colleague by e mail When opening the copied link URL in an in
28. d by clicking it with the mouse A list of all available test stations is shown Select a test station to include by clicking it Test stations station 001 station 002 station 003 station 004 station 005 station 006 station 007 station 006 station 009 To select more test stations simply select another test station by clicking it Test stations Station 001 x station 002 Station 003 Station 004 station 005 station 006 station 007 station 006 station 009 station 010 Page 37 of 69 IM Electroni CPT User Guide CIM Electronics To search for a specific test station simply type any part of the test station name Test stations Station 001 x 00 station 002 station 003 station O04 station 005 station 006 Station 00T Station O06 Station 009 Remark Test stations are not related to specific tests Therefore all known test stations can be selected Since test stations is not a mandatory field there can be test results without any relation to test station Available in the following report s Report Default filter Advanced filter SPC S S X TimeSeries Jooo S X Test Result Test Yield Test Step Yield Le Test Step Error Pareto J o o Test Duration Jooo Test Step Duration oo Page 38 of 69 CPT User Guide CIM Electronics 5 11 Test fixtures Limits data so that it on
29. duled reports Document type Send out the report as PDF Excel or both Filter Set all parameters for the selected report type to obtain the required data in the scheduled reports Please refer to the sections describing the reports section 4 9 or section 4 11 Page 65 of 69 IM Electroni CPT User Guide CIM Electronics 7 Personal settings 7 1 Settings To edit personal settings select User name to the right in the menu bar and click Settings In the example below the user name is Administrator CIM SPC BENUE Reports System Administrator Edit Personal Settings 2 DASHBOARD Days back in time 30 Minimum number of tests 100 PRESENTATION Table page size 10 rows Y Number format Danish Denmark k ACCOUNT New password Leave blank to not change password Confirm password Dashboard Settings Days back in time Number of days to look back in Dashboard reports Minimum number of tests The number of tests required to qualify for appearance on the dashboard Presentation Settings Table page size Specifies the number of rows per page in reports presenting data in grids tables Number format Specifies how numeric measurements are presented Account Settings New password Used to set a new user password Comfirm password Used to set a new user password Must be identical to New password Save button stores changes 7 2 Sign out Sign out and present the sign in page Page 66 of
30. eesseeeseeess 26 s REO O e A E E 27 Sle PRRONI e O e E EE 27 3e TE PENO E ee Cea ne ere re 27 De E e vector ecuuatenssecuseeesansed ae wicraneaseniceia sca tautevantes saunas cadeueeaueeisases 28 Dt OS a toons eateries adetanandsiseicugsasaecosacios E stu vceta cacaiteaauatesene 29 o a en ee are ere ee eee re errr eee ee 31 OSU SCC e E E ceca E E neues E AA E A E E EE E 33 FEU eee E E E E A N ee 34 So LoT E E E een aaaeceaoiewepeaah eae 35 S VOSU SCC CV CIS scania E 36 S10 OSE SE ACION S srice EE E 37 DALTE E mene re er eer ee ee eee nee 39 Diez NSE VSI SION acetate erietdis ence ca created E A E 41 De SC OV raat E E A eo pode ns AAE sense A AA AATE E TE E AE ENTE E ancient 42 5 14 Measurement range ccsccssccsecesccsccesccsccesscsecesscsecesseseceesesecessesecessesecesstsecesstsecesstseceesesees 43 SALS TE S A OY T EA E E E A ce ese EE E E EEE cea 45 SI enO UV E i a S E E T 46 SMEAG Fy SO p E sien E PEE E EE E EE EEEE ET EE E E E E E E EE 46 By EM EA E EN E N E A A E N E A E A E E E E E EES 48 SAS E O e E E 49 Page 2 of 69 CIM Electronics connect ng technologies CPT User Guide OTME 6 gene anne re ne a ee ee 49 SPARU a pa E E EAE ce ce ae 50 SE adaa UV EMS OT ee cere cata iso sete ocean ras ate cme tse c sansa one aaa S 50 SN a cies cera oe ct E ov cones pens op pene oieyeeve toa aan iewerseaueeaes 51 6 1 User management sssssssessrssssesresssrrsresessrsresrsressesrsresessroresreressesrore
31. es are denoted 30 and 30 and are normally called control limits e Series Chart Time based XY chart showing all measurements for the given filter criteria The chart also contains indications of the values USL LSL as well as the above mentioned control limits denoted 30 and 30 e Distribution Chart Chart showing the distribution population of the measurements in the given filter criteria Following the prerequisite that SPC can only be done on data which has a normal distribution the chart should show a clear Bell Curve of the distribution The chart also contains indications of the values Min USL Max LSL as well as the above mentioned control limits denoted 30 and 30 The Time Series report can be used to check the normal distribution of the selected data According to the empirical rule for normal distribution only 0 3 of the measurements should lie outside the control limits This means that in case the distribution shows more than 0 3 outside the control limits the distribution might not have a proper normal distribution or the process producing the measurements are out of Statistical control Production outside statistical control is a good reason to check the selected data further Page 14 of 69 CPT User Guide CIM Electronics To get the Time Series report fill out the appropriate filter options and click the Search button CIM SPC Dashboard Reports System Export Administrator Reports Time Se
32. eto Test Duration Test Step Duration gt x lt 5 17 Unit Revision Limits data so that it only includes data from the selected unit revision s By default all unit revisions are selected To select a unit revision to include set focus onto the unit revisions field by clicking it with the mouse A list of all available unit revisions is shown Select a unit revision to include by clicking it Page 46 of 69 CPT User Guide CIM Electronics mi 0A03 0AOT 0A09 0A11 0A13 0A14 0A16 OBO I Unit revisions To select more unit revisions simply select another unit revision by clicking it 0 OAO T 0A09 0A11 0A13 0A14 0A16 OBO 0B00 Unit revisions 0A03 x ETN Page 47 of 69 CPT User Guide CIM Electronics To search for a specific unit revision simply type any part of the unit revision name QA03 QAO 0A09 0A11 0A14 0A16 VAlu Unit revisions 0A13 a Remark Unit revisions are not related to specific test stations tests etc Therefore all known unit revisions can be selected Since unit revision not is a mandatory field there can be test results without any relation to a unit revision Available in the following report s Report Default filter celal filter SPO TimeSeries Jo Test Result Repair Pareto a J Lt J Test Step Duration 5 18 Item Limits data so that it only includes data from the selected item To select an item t
33. gement Provides access to management of users and security groups E Data Management Provides access to management of item groups etc E Import Tasks Provides access to configuration of Import Tasks Save stores changes to the security group Delete removes the security group from all users and deletes the security group from the system This action may affect the access rights of existing users Page 55 of 69 CPT User Guide CIM Electronics 6 2 Data management Provides functions to control and manage items 6 2 1 Items Define the relations between item numbers identifiers and their item names Item names are used as an alias for item numbers to make items easier to recognize and filter out CIM SPC BELULO Reports System Administrator System Items Q Q i Showing 1 to 3 of 3 items Number Name Created G cCIimo01 Universal mainboard 2013 11 08 09 48 33 cCiMo02 Enterprise mainboard 2013 11 08 09 48 33 CIM003 Car display 2013 11 08 09 48 33 6 2 1 1 Edit items To edit an existing item number name relation click the edit icon amp in the Item list CIM SPC BEIO e Reports System Administrator System Items Edit Item CIM001 o Item number CIM001 ltem name Universal mainboard Save stores the changes to the item name 6 2 2 Item Groups Defines the grouping of items Item groups can be used to control item access rights for user groups CIM SPC Dashboard Reports System Administrator
34. i Status Showing 1 import tasks Timestamp Name State Message Last import Last import error Avg import time Total imports Total import errors Details 2013 12 17 23 30 32 Simulated Test Results Idle No data pending 2013 12 17 23 30 32 93 ms 3 401 0 Automatically updated every 10 seconds Error Log Q x No import task errors to show Timestamp y Name Error type Error message Details No matching import task errors found The query is limited to the latest 10 000 import task errors 6 4 Scheduled Reports Scheduled reports are used to send out predefined reports at a specified time and with a specified frequency Reports are sent out by e mail to predefined receivers The layout of the scheduled reports is chosen among the existing reports Test Yield report and Test Step Error Pareto report CIM SPC Dashboard Reports System Administrator System Scheduled Reports New Scheduled Report Q 1 Showing 1 to 3 of 3 scheduled reports Enabled y Name Description Run as Modified Modified by Yes Daily Test Step Error Pareto spcdemo cim as 20 9 8 back CIM SPC Demo cim 2013 12 17 10 06 23 Administrator admin Sent out on weekdays a j 30 days back Sent out on weekdays Per Clausen pcl 2013 11 13 21 06 12 Administrator admin G Yes Daily Test Yield spcdemo cim as G Yes Monthly Test Step Error Pareto spcdemo cim as Previous month Administrator admin 2013 11 24 23 39 35 Administrato
35. in the following report s Report Default filter Advanced filter SPC ee E TimeSeries o o X o Test Result a Repair Pareto e Test Yield re Test Step Yield ee SS TT OO gt x lt TestResult So X Repair Pareto o X TestYield 0X TestStepYield X 5 4 Test Limits data so that it only includes data concerning the selected tests By default all items are selected however this is an inter related field see section 5 1 so a selection in one of the other related fields will influence the available contents of the Test field To select a test to include set focus onto the Test field by clicking it with the mouse A list of all available tests is shown Select a test to include by clicking it Page 29 of 69 CPT User Guide CIM Electronics Test Car display test CIM Mainboard CIM mainboard test 1 CIM mainboard upload no numeric measurements Mainboard 1 Mainboard 2 Mainboard function test Mainboard software upload Mainboard test 1 To search for a specific test simply type any part of the test name Car display test Remark If specific Item s are selected the available tests are limited to tests related to the selected item s Available tests can also be limited by assigned user rights Available in the following report s Report Default filter Advanced filter SPC XX f TimeSeries Jo XX o Repair Pareto e Page 30 of 69 CIM Electronics CPT User Guide connecting technologies 5
36. lue Sigma level Defects PPM 0 333 691000 0 667 308500 13330 4 620 2000 6 34 Please note at the above show conversion between sigma level and Cpk value is an estimate Further the conversion assumes a 1 5 sigma shift For further details please refer to Six Sigma literature Notes on specification limits Min USL and Max LSL In some cases the upper and lower specification limits USL and LSL vary within the data selected by the filter In those cases all statistical values are calculated from a worst case perspective using the minimum upper specification limit and the maximum lower specification limit found in the filtered data When presented in the SPC report these values are denoted Min USL and Max LSL respectively All calculated Page 12 of 69 CPT User Guide CIM Electronics connecting technologies statistical values in the SPC report are calculated using the formulas described in section 8 using the Min USL and Max LSL as specification limits in the formulas Notes on C and C x values By definition the Cpk value is the adjustment of Cp for the effect of non centered distribution a centered distribution has its mean value right in the middle of LSL and USL Cpk is calculated both against USL denoted Cpk USL and against LSL denoted Cpk LSL The final Cpk value is the lower of these two values This means that if the distribution is centered or close to centered Cpk equals Cp On the othe
37. ly includes data from the selected test fixture s By default all items are selected however this is an inter related field see section 5 1 so a selection in one of the other related fields will influence the available contents of the Test fixtures field To select a test fixture to include set focus onto the Test fixtures field by clicking it with the mouse A list of all available test fixtures is shown Select a test fixture to include by clicking it Test fixtures Fix 001 Fix O02 Fix O03 Fix O04 Fix 005 Fix 006 Fix 007 Fix 008 Fix 009 To select more test fixtures simply select another test fixture by clicking it Test fixtures Fix 002 x Fix 001 7 Fix 003 Fix 004 Fix 005 Fix 006 Fix OOF Fix O06 Fix 009 Virtual Fixture Page 39 of 69 CPT User Guide CIM Electronics To search for a specific test fixture simply type any part of the test fixture name Test fixtures Fix 002 x fix 0 Remark Test fixtures are not related to specific test stations tests etc Therefore all known fixtures can be selected Since test fixture not is a mandatory field there can be test results without any relation to test fixture Available in the following report s Report Default filter Advanced filter SPC Ooo o X TimeSeries X Page 40 of 69 CIM Electronics connecting technologies CPT User Guide 5 12 Test version Filters on the version of the Test software used to test the
38. m Import Tasks New File Import Task New Database Import Task New MS Access Import Task Q 1 Showing 1 to 1 of 1 import tasks Enabled y Reader Name Description Modified Modified by G Yes CPT XML File Simulated Test Results 2013 12 11 20 04 34 Administrator admin Page 57 of 69 CPT User Guide CIM Electronics 6 3 1 1 Edit an existing import task To edit an existing data importer task click the edit icon inthe importer task list CIM SPC Dashboard Reports System Administrator System Import Tasks Edit File Import Task oe GENERAL Enabled Yes No Name Simulated Test Results Description 4 Max test results per unit 50 2 DEFAULTS ltem number i Test name 2 Test station 3 Test fixture i TEST RESULT FILES Reader CPT XML File E Pickup files from C CPT CPT_XML Pickup FILE HANDLING OPTIONS Delete imported files Zip imported files to save space Move imported files to a E Delete files with error Zip files with error to save space Move files with errorto C CPT CPT_XML Error 2 Save stores the changes to the importer task Delete deletes and disables the importer task permanently all parameters will be lost 6 3 1 2 Creating a new file import task To setup the necessary parameters for importing test data from a file the button New File Import Task should be clicked Page 58 of 69 IM Electroni CPT User Guide CIM Electronics CIM SPC BERITE Reports Sys
39. n Administrators Default administrative user group Users Default user group with access to all reports full item access If a user is a member of more security groups it is the sum of all allowed items and pages that defines the final access rights for the user Page 53 of 69 CPT User Guide CIM Electronics 6 1 2 1 Add new security group To add new security groups click the New Security Group on Security Group page Fill in the fields on the page and click Save CIM SPC Dashboard Reports System Administrator System Security Groups New Security Group Name Description Users Select some users Accessible item groups Select some item groups Allowed permissions Administrator Provides full access to all features and all Items E Access to all Items Provides access to all Items in the system Dashboard Provides access to the Dashboard SPC Report Provides access to the SPC Report Time Series Report Provides access to the Time Series Report Unit Overview Report Provides access to the Unit Overview Report Test Yield Report Provides access to the Test Yield Report Test Step Yield Report Provides access to the Test Step Yield Report Test Step Error Pareto Report Provides access to the Test Step Error Pareto Report Test Duration Report Provides access to the Test Duration Report Test Step Duration Report Provides access to the Test Step Duration Report
40. n the following report s Report Default filter Advanced filter TimeSeries Jooo S X Page 45 of 69 CPT User Guide CIM Electronics 5 16 Serial no range Filters on specific serial numbers Serial no range From seral no To serial no There are two ways to search for serial numbers Either by filling in only From serial no or by filling in both From serial no and To serial no From serial no only The character can be used as a wild card to create a search like this AT8IN10 HAO9 The result of this search will be all the units ranging from AT8INLOOOOOHAOS to AT8IN109999HAOS assuming that is the format of the given serial number The can be any character not only numbers and any number of characters From serial no and To serial no When using both From serial no and To serial no the character cannot be used Instead type in two serial numbers like this From AT8IN100000HA0Q09 to AT8IN109999HAOS The result of this search will be the same as above all units ranging from AT8IN1OO000HAOS to AT8IN109999HAOSY Also the From To search is based on characters not numbers so searching like this would also be valid From AT8IN100000AA09 To AT8IN100000ZZO9 Available in the following report s Report Default filter Advanced filter SPC es X TimeSeries Jooo S X Test Result Repair Pareto Test Yield Test Step Yield E Test Step Error Par
41. ne or more Test Results Page 17 of 69 CPT User Guide CIM Electronics To see and compare specific test step measurements select appropriate tests in the Test Overview section The view is automatically updated during test selection CIM SPC Dashboard Reports System Export v Administrator Reports Unit Overview 27 tem CIM003 Car display Serial no 10085327 Test Overview Test status Unit has passed test Showing 3 test results Show Test time y Test Testrun Test result Test station Test fixture Test operator Test version Unit revision Import time E 2013 08 26 02 32 40 Car display test 3 of 3 Passed Station 013 Virtual Fixture Operator Operator 002 2013 08 26 02 44 40 2012 07 18 05 25 31 Car display test 2 of 3 Passed Station 013 Virtual Fixture Operator Operator 002 2012 07 18 05 37 31 2012 07 18 05 19 04 Car display test 1 of 3 Failed Station 013 Virtual Fixture Operator Operator 002 2012 07 18 05 31 04 i Test Step Results Q on ee a ony ae ee Showing 1 to 10 of 12 test step results Test order Test step Test run 1 value Test run 1 result Test run 2 value Test run 2 result Current measure 47 000 E 03 Passed 47 000 E 03 Passed SW update 1 000 E 00 Passed 1 000 E 00 Passed SW update 1 1 000 E 00 Passed 1 000 E 00 Passed Check Volumepot 1 015 E 03 Passed 1 016 E 03 Passed Vision check 1 000 E 00 Passed 1 000 E 00 Passed Keyboard Test 1 000 E 00 Passed 1 000 E 00 Passed Analog 1 16 000 E 03
42. o Test Duration Test Step Duration Page 32 of 69 CPT User Guide CIM Electronics connecting technologies 5 6 Test step Limits data so that it only includes data concerning the selected test step By default all items are selected however this is an inter related field see section 5 1 so a selection in one of the other related fields will influence the available contents of the Test Step field To select a test step to include set focus onto the Test step field by clicking it with the mouse A list of all available test steps is shown Select a test step to include by clicking it Test step a Test 10 Test 11 Test 12 Test 13 Test 2 Test 3 Test 4 Test 5 Test 6 To search for a specific test step simply type any part of the test step name Test step Keyboard Test 1 Jest 1 Jest 10 Test 11 Jest 12 Jest 13 Remark A least one item or test must be selected before a specific test step name can be selected Available in the following report s Report Default filter Advanced filter SPC a ee eee TimeSeries X Repair Pareto a a Page 33 of 69 IM Electroni CPT User Guide CIM Electronics 5 7 Test result Limits data so that it only includes data with the selected test result parameter To change the test result parameter set focus onto the Test result field by clicking it with the mouse A list of all available test results is shown Select a test result to include by cli
43. o include set focus onto the Item field by clicking it with the mouse A list of all available items is shown Select an item to include by clicking it CIMO01 Universal mainboard CIMO002 Enterprise mainboard CIMO03 Car display To search for a specific item simply type any part of the item number or name Page 48 of 69 CPT User Guide CIM Electronics ltem Select an item CIM003 Car display Available in the following report s Report Default filter Advanced filter Unit Overview o XK 5 19 Serial no Used to find a specific unit Serial number must be identical to the unit s serial number Serial no Enter a serial no Available in the following report s Report Default filter Advanced filter wnitoveriew O T a SSS 5 20 Time scale Time scale is used to group presented data Time scale Week Day Week Month None Parameters Hour Group data selection in hours Day Group data selection in days Week Group data selection in weeks Monday is the first day of the week Month Group data selection in months None Group data as one selection Page 49 of 69 IM Electroni CPT User Guide CIM Electronics Available in the following report s Report Default filter Advanced filter Test Yield Test Duration 5 21 Time element Time element is used to filter by test and or handling time Time element Both test and handling time Both test and handling time
44. r admin 6 4 1 Adding and Editing scheduled reports To edit an existing scheduled report click the edit icon in the scheduled report list To add a new scheduled report click New Scheduled Report Page 62 of 69 i CPT User Guide CIM Electronics Save stores the changes to the importer task Delete deletes and disables the scheduled report permanently all parameters will be lost Delete is only available when editing an existing scheduled report 6 4 1 1 Settings Recipients and Recurrence CIM SPC Dashboard Reports System Administrator System Scheduled Reports Edit Scheduled Report 2 Settings Recipients and Recurrence Report and Filter Enabled Yes No Time of day 09 00 O Error Pareto spcdemo cim as Name Description 90 days back Sent out on weekdays RECIPIENTS Users pel x Email addresses km cim as ldi cim as rd cim as RECURRENCE Start date 2013 11 13 2 Pattern Daily Every weekday Ly Weekly Monthly General Settings Enabled Used to enable or disable the scheduled report generation Time of day The time of day to send out the report Name Descriptive name of the report Description Further detailed description for the report Recipients Users List of system users to receive the report E mail addresses Additional recipients of the report unknown to the system Recipients Start date The begin date for the scheduled reports Page 63 of 69 CI
45. r hand if Cox is relatively much less than the C value this indicates a mean value far off the center of USL and LSL In these cases something significant might have changed within the production process or perhaps USL or LSL simply needs adjustment to cope with changed circumstances Cpk values above 2 corresponding to less than 3 4 defects per million is a clear indication that USL and LSL are set at a level allowing almost everything to pass through the test To get the SPC report fill out the appropriate filter options and click the Search button CIM SPC Dashboard Reports System Export Administrator Reports p PA PP AP PAPAPPA SPC Test period Items CIMO03 Car display Test Test step Test result Test run Test step result Test step cycle Test Car display test Car display test Car display test Car display test Car display test Car display test Car display test Car display test Car display test Car display test Passed Last test run Passed Last test step cycle Test step Analog 1 Analog 2 Analog 3 Analog 4 Analog 5 Analog 6 Analog 7 Analog measurem 3 Check Display Check Display v 0 2013 06 23 Today 00 00 00 Range Window Showing 1 to 10 of 39 entries Cpk USL 3 676 6 156 24 124 i 1 451 3 068 1 851 20 022 14897 Cpk LSL 0 793 10 177 19 734 2 808 0 678 3 057 16 378 3 489 Mean 15 742 E 03 102
46. reen shots and filter options availability most pages 1 3 2014 05 11 PCL Removed obsolete Test completion filter and added Test categories filter Page 69 of 69
47. rements with Min set to 95000 and Max set to 105000 Measurement range Min 95000 Max 105000 b Series Chart Q xXaxis Yaxis Both axes Reset 115 000 E 03 Wl icasurement E 30 E ean E 3c E EL LSL 110 000 E 03 105 000 E 03 100 000 E 03 95 000 E 03 90 000 E 03 85 000 E 03 2011 10 01 00 00 2012 01 01 00 00 2012 04 01 00 00 2012 07 01 00 00 2012 10 01 00 00 2013 01 01 00 00 2013 04 01 00 00 Available in the following report s Report Default filter Advanced filter TimeSeries o oo S X Page 44 of 69 CPT User Guide CIM Electronics 5 15 Sort by Used to present data in the Time Series graph either by time stamp date or by serial number The sorting of serial numbers is handled as texts sort by Time Serial no Example of text sort SER1 SER2 SER20 SER3 Example of data presented by time b Series Chart Q xXaxis Yaxis Both axes Reset 1 100 E 00 E iasurement E o 1 050 E 00 E ean E 3c MB sL 1 000 E 00 LSL 0 950 E 00 0 900 E 00 0 850 E 00 0 800 E 00 0 750 E 00 0 700 E 00 2010 07 01 00 00 2011 01 01 00 00 2011 07 01 00 00 2012 01 01 00 00 2012 07 01 00 00 2013 01 01 00 00 2013 07 01 00 00 Same data presented by serial no b Series Chart Q xXaxis Yaxis Both axes 1 100 E 00 Wl Measurement E 3c 1 050 E 00 MM Mean E 3c MB USL 1 000 E 00 LsL 0 950 E 00 0 900 E 00 0 850 E 00 0 800 E 00 0 750 E 00 0 700 E 00 Available i
48. ries 2 Test period 2013 06 01 Today 00 00 00 23 5 Range Window Default Advanced Items CIM001 Universal mainboard x Test Mainboard 1 Test step Calibration Power Level Test result Passed Test run Last test run Test step result Passed Test step cycle Last test step cycle ke Calculated Values Cp Cpk Cpk USL Cpk LSL Mean o 30 30 Min USL Max LSL Measurements 1 957 1 940 1 975 1 940 2 004 E 00 85 147 E 03 1 749 E 00 2 260 E 00 1 500 E 00 2 500 E 00 3 983 b Series Chart Q Xaxis Yaxis Both axes Reset 1 400 E 00 E Measurement E 0o E ean 1 800 E 00 ME 2c mus E LSL 1 800 E 00 2 000 E 00 2 200 E 00 2 400 E 00 2 800 E 00 2013 06 01 00 00 2013 07 01 00 00 2013 08 01 00 00 2013 09 01 00 00 2013 10 01 00 00 2013 11 01 00 00 2013 12 01 00 00 2014 01 01 00 00 E Actual distribution E Normal distribution E 30 E Mean E 2c GB Min USL E Max LSL N 2 800 E 00 2 500 E 00 2 400 E 00 2 300 E 00 2 200 E 00 2 100 E 00 2 000 E 00 1 900 E 00 1 800 E 00 1 700 E 00 1 800 E 00 1 500 E 00 1 400 E 00 b Distribution Chart Q Xais Yaxis Both axes Reset Page 15 of 69 CIM Electronics connecting technologies CPT User Guide 4 7 Test Result report The report shows the most recent test data and test results imported by the system Typical use The Test Result report is typically used to get an over
49. sssreoresrssrssoseereseeseerees 51 EL MS a E 51 6 1 2 Security GrOUDS oa raster gps cipe ahs ea E a 53 6 2 Data Fa SG ease erste ay EEE EE ES 56 Zick E a E E E EE E E EEE TE E E E ETE OE E E nanseea 56 O22 WEM GROWS areni Tn E E R 56 Do MPATE a E E T 57 orto al Ue E a E E E EE ee E eee 57 6 32 WOO Task MONOT escort ceeds r E osusceen seus 62 CA E OREO a ne nn ke OSPR ce eee eee 62 6 4 1 Adding and Editing scheduled reports cccccccsssccceessececeesececceeceeseesecessusecessunecss 62 F Perono eUe ea ee er ee ee 66 Docks SOUE va sntesteasiiussevgniaevestiattecyntac E E A 66 F N O e E tedissuevondanectedvaenetnaet 66 Br SEA UISUICa Call CUA LIONS secession ia S 67 de POU AS cs scoaheetetaeensgeca nnneduceeneaued E E 67 SLT Men Walt coscsetecosaatetebosgudvcnncs A EA 67 eE ea eege ke Ee iO A A E E A E E EEEE 67 ea CPA C e A E E 67 eda CAO II IOC OIC ee A 67 82 SCC lal VANS Weil UMS sese E 68 gt RE VISIONN FAIS COU e a ecsbewseits emecrn vans coke E E EEEN 69 Page 3 of 69 CPT User Guide CIM Electronics connecting technologies 1 Signin CIM SPC Sign in Sign in 2 Please sign in Username Password r CIM Electronics connecting technologies To sign in enter provided username and password and press the Sign in button When signed in the Dashboard page is presented Page 4 of 69 IM Electroni CPT User Guide CIM Electronics 2 Man menu The CIM SPC main menu line is placed a
50. st Step Error Pareto a Test Duration Test Step Duration Page 42 of 69 CPT User Guide ih atc br 5 14 Measurement range Measurement range is used to filter numeric measurements The Min and Max value can be used together or individually Measurement range Min Max Example Measurements without Min or Max set b Series Chart Q xXaxis Yaxis Both axes Reset 115 000 E 03 E Measurement E 3c E Mean 110 000 E 02 E o E sL LSL 105 000 E 02 A 0 A e ay A KJ wT a OF 4 e e AA ADA 7 A of y AAY Aata a AV arta da ars aTa aaya a iYe e Ya nan ACE DANG avis Arawa A EART Phat ee Lae ek TTE TTN TA ee ysa T 2 ray aqta aya g ega P a 2 100 000 E 03 95 000 E 03 90 000 E 03 85 000 E 03 2011 10 01 00 00 2012 01 01 00 00 2012 04 01 00 00 2012 07 01 00 00 2012 10 01 00 00 2013 01 01 00 00 2013 04 01 00 00 Measurements with Min set to 95000 and no Max limit Measurement range Min 95000 Max b Series Chart Q xXaxis Yaxis Both axes Reset 115 000 E 03 E tasurement E 3c E ean 110 000 E 03 E o ae LSL 105 000 E 03 A ace r P re er havian EAI Avantan gaa rave gagavavaaan vrasa au Y i na 100 000 E 02 95 000 E 03 90 000 E 03 85 000 E 03 2011 10 01 00 00 2012 01 01 00 00 2012 04 01 00 00 2012 07 01 00 00 2012 10 01 00 00 2012 01 01 00 00 2012 04 01 00 00 Page 43 of 69 CPT User Guide CIM Electronics connecting technologies Measu
51. t the top of the page CIM SPC Dashboard Reports System Export Administrator Reports Time Series B The above menu is taken from the reports SPC page This is indicated by gray area This area shows the actual page You can click in the gray area to shortcut back in the menu To select a main menu item simply click the text in in the green area 2 1 Menu items CIM SPC Opens info page about CIM SPC including build version etc Dashboard Opens the Dashboard page Reports Opens the main report page System Opens the system main page Question mark Opens the user manual Remark Depending of the assigned user rights some menu items will not be available Page 5 of 69 CIM Electronics connecting technologies CPT User Guide 3 Dashboard To enter Dashboard click the Dashboard text in menu line CIM SPC BECEL Reports System Administrator The Dashboard shows the performance of the test data by providing a top 15 of Most Tested and Worst Yield tests CIM SPC Dashboard Reports System Administrator Dashboard o Dashboard information for the past 30 days created 2013 12 17 18 44 47 Items with less than 100 tests excluded Most Tested Worst Yield Item Test Yield Item Test Yield CIMO001 Universal mainboard CIM003 Car display Car display test 78 7 CIM002 Enterprise f nibni Mainboard function test 47 9 CIM002 Enterprise mainboard
52. tem Administrator System Import Tasks New File Import Task D GENERAL Enabled Yes No Name Enter a name Description 4 Max test results per unit 25 DEFAULTS ltem number Test name i Test station a Test fixture 2 TEST RESULT FILES Reader Select a reader Jal a Pickup files from Enter a path FILE HANDLING OPTIONS El Delete imported files Zip imported files to save space Move imported files to E Delete files with error Zip files with error to save space Move files with error to a All necessary parameters should be filled out before saving and enabling the new file importer task Additional help for each parameter is displayed when moving the mouse pointer over the question mark to the right of each parameter field Page 59 of 69 IM Electroni CPT User Guide CIM Electronics 6 3 1 3 Creating a new database import task To setup the necessary parameters for importing test data from a database the button New Database Import Task should be clicked CIM SPC Dashboard Reports System Administrator System ImportTasks New Database Import Task a GENERAL Enabled Yes No Name Enter a name Description Max test results per unit 25 2 DEFAULTS ltem number Test name Test station Test fixture DATABASE SETTINGS Reader Select a reader z Server i User Password Catalog 8 All necessary parameters should be filled out before saving and enabling the new database importer task
53. ternet browser the same report content will reappear based on the original filter options 5 1 Filter option relations Some filter options are inter related This means that for these inter related filter options only existing combinations can be selected as search criteria for a given report For example If a filter option for Test is filled out all other filter options related to Test are pre filtered so that they only contain values that relates to the selected value for Test The following filter options are inter related e Items e Test e Test step e Test station e Test fixture 5 2 Test period Defines start and end time for data selection Test period 2012 10 14 Today 90 00 00 23 59 55 Range Window To select a date using a calendar window select date field with a single click Double click a date field if the date is entered manually using the keyboard Date field is formatted as yyyy MM dd year month day Time field is formatted as hh mm ss hour minutes seconds Time span Range or Window Defines how data is selected over a day e Range Selects all data in the time range given in Test period filter e Window Selects only data between start time hh mm ss and end time hh mm ss each day between start date and end date This feature can be used to filter work shifts etc Example Test period 2012 03 29 2013 04 29 16 00 00 23 00 00 Range Window
54. ton CIM SPC Dashboard Reports System Export Administrator Reports Test Step Error Pareto Default Advanced Test period 2013 06 01 Today 00 00 00 23 59 59 Range Window tems CIM003 Car display x Tests Testrun First test run Test step cycle Last test step cycle Q Showing 1 to 10 of 28 test steps Test Test step Total Passed Failed Aborted Failure y Car display test Car display test Car display test Car display test Car display test Car display test Car display test Car display test Car display test Car display test Test 4 Vision check 1 Keyboard Test 1 Vision check Keyboard Test Check Display Test 5 Test 1 Check Display v 0 Check Volumepot 1 8 638 6 876 6 146 8 569 7 798 3 859 7 568 10 096 1 073 7 109 7 790 6 475 5 821 6 162 7 494 3 719 7 326 9 819 1 046 6 934 Page 23 of 69 CIM Electronics connecting technologies CPT User Guide 4 12 Test Duration report Time based stacked bar graph showing the relation between the total test and handling time for selected tests The number of tests performed is shown in a separate XY line Typical use The Test Duration report can be used to map the time used to test a product It shows the relation between testing time and handling time between two tests Handling time is defined as the time from the end of one test until the beginning of the next test In essence handling
55. units Test sequence version By default all test versions are selected To select a test version to include set focus onto the Test version field by clicking it with the mouse A list of all available test versions is shown Select a test version to include by clicking it Test version To search for a specific test version simply type any part of the test version name Test version Remark Test version is not related to specific tests Therefore all known test versions can be selected Since test version isn t a mandatory field there can be test results without any relation to test version Page 41 of 69 IM Electroni CPT User Guide CIM Electronics Available in the following report s Report Default filter Advanced filter SPC S S XX TimeSeries Joo o Test Result A Test Yield Test Step Yield Test Step Error Pareto a Test Duration _ Test Step Duration i 5 13 Test category Filter on one or more test categories Test categories can for example be Production or Commissioning If all real production data is marked with test category Production the filter can be used to filter out all data that is not related to units being produced Note The filter depends on the availability of test category in the data being imported Available in the following report s Report Default filter Advanced filter SPC S S X TimeSeries X Test Result Test Yield Test Step Yield Te
56. ust be selected as a filter option along with the Item itself Page 20 of 69 IM Electronics CPT User Guide CIM El technologies 4 10 Test Step Yield report Numeric details and graphical presentation of the yield for each individual test step for a selected test The combined bar graph shows test steps and their yield Typical use The Test Step Yield report can be used to determine which of the performed tests are the most likely to fail and which steps are most likely to always succeed A common picture on this report indicates that half of the test steps performed hardly ever fails There can be several reasons behind this but it could be a sign that the specification limits USL and LSL for these test steps are too conservative and as a result almost never catches any errors Another reason could be that the step is not necessary at all Whatever the reason a test step that does not directly improve quality by catching errors could be considered a waste of testing time and an undesired increase in production time and costs Put together it might be a potential for increased yield Page 21 of 69 CPT User Guide CIM Electronics To get the Test Step Yield report fill out the appropriate filter options and click the Search button CIM SPC Dashboard Reports System Export Administrator Reports Test Step Yield e Test period 2013 06 01 Today 00 00 00 23 59 59 Range Window Default Advanced Items CIM00
57. view of what has recently been tested in the production It provides an overall overview of tests performed on units the number of re tests performed test station names and test operators By setting the appropriate filter options the report can be used to see what has been tested on a given station It also provides an efficient tool to check if re testing is widely used for certain products or certain periods during the day By entering a specific serial number for a unit in the filter options test data for that specific unit can be found and displayed To get the Test Result report fill out the appropriate filter options and click the Search button CIM SPC Dashboard Reports System Export Administrator Reports Test Result 2 Test period 2012 10 14 Today 00 00 00 Range Window Default Advanced Items CIM001 Universal mainboard x Tests Test result Passed Test run Last test run Q 1 2 Showing 1 to 10 of 10 000 test results Test time y Serial no Item Test Testrun Test result Teststation Test operator Import time Q Q Q Q Q Q Q Q Q Q 2013 12 17 15 44 21 2013 12 17 15 38 28 2013 12 17 15 10 33 2013 12 17 15 06 09 2013 12 17 14 57 20 2013 12 17 14 50 00 2013 12 17 14 45 34 2013 12 17 14 32 20 2013 12 17 14 27 55 2013 12 17 14 22 03 SN635226918610568282 N6352286915087599532 SN635228898333224532 SN635228895691662032 SN635228890403693282 SN635228886002443282 SN63
58. yield for a number of selected tests Each pi deviation g Cp and Cpk index values as well as specification limits bar in the graph shows the passed failed relation of the performed tests Time Series Test Step Yield mu S Time based XY graph and the normal distribution graph of the measurements for a specific test step Statistical analysis values are shown for the selected measurements Numeric details and graphical presentation of the yield for each individual test step for a selected test The combined bar graph shows test steps and their yield A Test Result Test Step Error Pareto Provides an overview in list form of tests performed in the production Sorted list of most frequent failed test steps for a selected item el Unit Overview Test step result and measurements for all performed test runs for a specific item serial number Test Duration Time based stacked bar graph showing the relation between the total test and handling time for selected tests The number of tests performed is shown in a separate XY line Repair Pareto Chart and sorted list of most frequent repairs entered via the Paperless Repair application Test Step Duration Detailed duration information for all test steps in a test To select a report move the mouse over the appropriate report square and select 4 1 Navigating in Data grids When report results are presented in a grid table as shown below the following navigation can

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