4265 and 4270 - Adler Instrumentos
Contents
1. LCR Meters Electronics Ltd Wayne Kerr Providing low and accurate components i production or environment Three low cost versatile models the 4270 4265 and 4260 offer a combination of powerful capabilities to meet the most demanding requirements quickly and effectively Features Comprehensive measurement functions including DC Resistance Test components to 1MHz Large LCD display with easy to read characters 0 1 basic accuracy IEEE 488 or RS 232 interface DC Voltage bias 9 instrument setups stored Display of actual Voltage and Current measurement Automatic zero trim The 4200 series combines superior performance measurement functions and a Contact check low price providing unbeatable value for money Operation is simple and straightforward with measurements undertaken at a wide range of test frequencies and voltage levels Features include a choice of interfaces IEEE 488 or RS 232 comprehensive measurement functions including DC Resistance a bin handling capability and component characterisation to 1 MHz Deviation measurement mode Directly print measured data The 4270 and 4265 have the widest choice of test frequencies For testing primary power components such as transformers and filter capacitors these instruments have 50 and 60 Hz test frequencies together with the 100 and 120 Hz ripple frequencies In the 100 Hz to 20 kHz range both LCR meters provide 100 Hz resolution f2. Test signal levels Basic measurement accuracy at 50 mV to 2 V 10 mV steps via 100 Q 0 1 1 digit 300 mV via 100 Q 1 V via 100 Q 2 V via 400 Q 7 different equivalent normal measurement mode for gt 0 25 V 0 1 1 digit for 1 V circuit diagrams Auto mode Contact Check 4270 only 5 Read out Dominant parameter Pass lt 3Q Parallel for R C Serial for R L Equivalent circuit diagram Manual mode Read out Dominant or secondary parameter Equivalent circuit diagram Parallel or serial selectable Measurement update rate 2 measurements s Trim function Open circuit Open circuit compensation Z gt 100 kQ Short circuit compensation Z lt 10g Short circuit Stored settings non volatile memory Front panel settings 1 trim figures included Fail Maximum measuring ranges Impedance Resistance AC Z or gt 3 Q with indication of failed connection lead Calibration Calibration interval 1 year Environmental conditions Operating temperature OSC to150 C 40 C to 70 C 100 120 220 240 V 10 Storage temperature Power requirements Line frequency 50 to 100 Hz Power consumption 16 VA EMC VDE 0871 Class B CISPR 11 Safety According to CE regulation 73 23 EN61010 CAT II CSA C22 2 No 231 Warm up time 5 minutes Rac 0 0000 Q to 200 MQ Resistance DC Roc 0 0000 Q to 50 MQ Capacitance E 0 00 pF to 31 8 F Inductance L 0 00 uH to 637 kH Quality factor Q 0 000 to
3. the family It allows testing at any frequency up to 1 MHz variable AC and DC test voltages deviation mode and is capable of handling a wide variety of components under realistic test conditions For testing to 100 kHz consider the 4265 It has a basic accuracy of 0 1 3 test voltage levels and 204 test frequencies providing a powerful yet low cost solution to component testing The simplest and most cost effective solution to component testing The 4260 has a 0 25 basic accuracy and is ideal for use in manufacturing as a quality assurance tool or in the service lab for quick tests on a wide variety of components It s equally at home in the classroom for education or in training environments Select the Wayne Kerr LCR meter that s right for your application 4270 4265 4260 Frequency range 50 Hz 1 MHz 50 Hz 100 kHz 1 kHz Measurement functions ARE O D0 Vx Ix A Series amp Parallel RIC OTD 0 Vx Ix Series amp Parallel Zmac T C O DA Series amp Parallel Rdc opt Rdc opt Basic accuracy 0 1 0 1 0 25 AC test signal level 50 mY 2V 50 mV 1V 2V 2V DC bias Voltage 0 10 V int 2 V int Ong lt 40 V ext lt 40 V ext Contact check Yes Averaging Yes 3 levels Yes Deviation mode Yes Test signal monitoring Current or voltage Current or voltage Remote interface IEEE 488 or RS 232 IEEE 488 or RS 232 TECHNICAL
4. time According to CE regulation 89 336 Emmission according to EN 55011 Group 1 Class B respectively CISPR 11 Immunity according to EN 50082 1 inclusive IEC 801 2 3 4 According to CE regulation 73 23 EN61010 CAT II Pollution Degree 2 CSA C22 2 No 231 30 minutes 5 minutes Dimensions and weight WxHxD 315 x 105 x 405mm 12 4 x 4 13 x 15 9 Weight 5 3 kg 11 7 lb 4 7 kg 10 4 lb ORDERING CODES OPTIONS ee Description Meter 1 kHz ser Manual and AC Meter DC 1 MHz with User Manual and AC rface supplied in place erface Accessories 9 pin female 9 pin set with Banana Plugs e set with Kelvin clips e set with Kelvin clips Id 2 4um USA Wayne Kerr Inc 165L New Boston Street Woburn MA 01801 1744 Tel 781 938 8390 Fax 781 933 9523 Sales 800 933 9319 email salesQwaynekerr com www waynekerrtest com Wayne Kerr Electronics Ltd UK Durban Road Bognor Regis West Sussex PO22 9RL Tel 44 1243 825811 Fax 44 1243 824698 email sales wayne kerr co uk www waynekerrtest com Distributors worldwide contact UK office ASIA 14F 6 No 79 Hsin Tai Wu Rd Sec1 Hsi Chih Taipei 221 Taiwan R O C Tel 886 2 2698 4104 Fax 886 2 2698 0716 email wksales microtest com tw www waynekerrtest com
5. 1000 Dissipation factor D 0 000 to 1000 Phase angle o 179 to 180 deg Voltage monitor Vx 0 1 uV to 2 00 V Current monitor Ix 0 005 uA to 10 0 mA Maximum resolution Impedance Resistance AC Z or Rac 0 1 MQ Resistance DC Roc 0 1 MQ Capacitance C 0 01 pF Inductance L 0 01 uH Quality factor Q 0 001 Dissipation factor D 0 001 Phase angle o 0 1 deg Voltage monitor Vx 0 1 uV Current monitor Ix 0 001 pA Circuit diagram Display Auto mode Read out Equivalent circuit diagram 1 of 7 different equivalent circuit diagrams Dominant and secondary parameter Parallel for R C Serial for R L Dimensions and weight WxHxD 315 x 105 x 405 mm RARAS x 15 9 Weight 3 8 kg 8 4 lb Manual mode Read out Equivalent circuit diagram Dominant and secondary parameter or Z D O Vx Ix Parallel or serial selectable Average function Function Exponential averaging in continuous mode Levels 3 and off 1 and off 4270 4265 Deviation mode 4270 only Relative range in respect to reference value 100 to 100 Measuring modes Normal Continuous Single 2 measurements s Triggered via TRIG key Triggered via handler interface Triggered via IEEE 488 or RS 232 Test frequency 50 60 100 120 Hz 200 Hz to 100 kHz 100 Hz steps 100 kHz to 1 MHz 1 kHz steps 50 60 100 120 Hz 200 Hz to 20 kHz 100 Hz steps 100 kHz DC optional D
6. C optional Read out Display or via IEEE 488 or RS 232 interface Fast Max speed 10 measurements s Test frequency 200 Hz to 100 kHz 200 Hz steps 100 kHz to 1 MHz 1 kHz steps 200 Hz to 20 kHz 200 Hz steps 100 kHz DC optional DC optional Single Triggered via handler interface Triggered via IEEE 488 or RS 232 Read out Via IEEE or RS 232 interface display blanked Binning Standard bins 9 Special bins Bin 0 and bin fail Bin programming via Bin limit programming IEEE 488 interface RS 232 interface Bin programmer 4265 only Absolute or relative Trim function Open circuit Short circuit Open circuit compensation Z gt 100 kQ Short circuit compensation Z lt 10 Q Protection against charged capacitors Ca 2 UF Vmax lt 200 V as Vinx lt 500 V zu 2 uF lt C lt 2 mF Vmax lt 47 x C mF Vmax lt 117 x C mF Vmax in V C in mF Vmax in V C in mF C gt 2mF Vmax lt 40 V Vmax lt 100 V Stored settings non volatile memory Front panel settings Bin settings 9 1 trim figures included 9 1 Print measurement results Via RS 232 interface for serial printers Calibration Calibration interval 1 year Environmental conditions Operating temperature 0 C to 50 C Storage temperature Power requirements Line frequency 40 C to 70 C 100 120 220 240 V 10 50 60 Hz Power consumption 44 VA 31 VA EMC Safety Warm up
7. SPECIFICATIONS 4260 4270 4265 AC test mode AC Test mode Test frequency 1 kHz Test frequency 50 60 100 120 Hz 50 60 100 120 Hz Test frequency accuracy 0 025 200 Hz to 100 kHz 100 Hz 200 Hz to 20 kHz 100 Hz steps Test signal level 2V via 400 Q source steps 100 kHz to 1 MHz 1 kHz 100 kHz Basic measurement accuracy 0 25 1 digit DC bias Internal 2V Maximum measuring ranges Impedance Resistance Z or Rac 0 000 Q to 200 MQ Test frequency accuracy Test signal levels Basic measurement accuracy at normal measurement mode steps 0 01 50 mV to 2 V 10 mV steps via 100 Q 0 1 1 digit for gt 0 25 V lt 50 kHz 0 1 x f 50 kHz 1 digit for gt 0 25 V gt 50 kHz 0 1 x 0 25 VAT 1 digit for lt 0 25 V lt 50 kHz 0 01 50 mV via 100 Q 1 V via 100 Q 2 V via 400 Q 0 1 1 digit for lt 20 kHz 0 4 1 digit 100 kHz 0 5 1 digit for 50 mV lt 20 kHz 2 0 1 digit for 50 mV 100 kHz Capacitance C 0 0 pF to 100 mF Inductance L 0 0 uH to 32 kH Quality factor Q 0 002 to 500 Dissipation factor D 0 002 to 500 Phase angle b 90 0 to 90 0 deg Maximum resolution Impedance Resistance Z or Rac 0 1 mQ Capacitance C 0 1 pF Inductance L 0 1 pH Quality factor Q 0 001 Dissipation factor D 0 001 Phase angle 0 1 deg DC bias Internal External 0 to 10 V 0 1 V steps 0 to 40 V 2V O to 40 V Circuit diagram DC Test mode Optional
8. llow fast convenient and accurate characterization of these components The binning function allows components to be sorted into ten bins By inserting the component in the test fixture the indicated bin number can be read from the display The optional handler interface provides lamp drivers for a visual indication of the proper bin or a pass fail indication along with an external measurement trigger input further speeding up the sorting process With the IEEE 488 interface the 4270 and 4265 can become the heart of a fully automated component testing environment for operation at up to 10 measurements per second Or with the RS 232 interface the tester can be controlled simply and economically from a PC in a standalone system for incoming inspection of components and devices Using the RS 232 interface measurement results can be output directly to a printer With so many built in capabilities the compact and versatile Wayne Kerr 4200 series LCR meters can be used in service laboratory or production environments And with the best measurement versatility and value in their class they are sure to prove a valuable addition where low cost straightforward testing is required and component accuracy and reliability are essential LCR Meters 4260 4265 4270 Function The Wayne Kerr 4200 series comprises three models to meet a wide range of performance and budget requirements The 4270 is the most versatile LCR meter in
9. or precision frequency characterisation For testing small value capacitors 100 kHz is also provided in the 4265 while the test frequency of the 4270 is continuously adjustable up to 1 MHz Component test voltage levels are variable from 2V right down to only 50 mV to keep sensitive semi conductor junctions below their voltage thresholds DC bias can be added either from the built in source or from an external source up to 40 V DC Testing electronic components with Wayne Kerr LCR meters is easy and in less than a second you ll see all you need to know on the large easy to read LCD display The dominant component value can be measured with a basic accuracy of 0 1 and displayed with its equivalent circuit diagram Measurement integrity is further enhanced with the use of Kelvin leads or test posts which connect directly onto the instrument s front panel The 4200 series LCR meters offer a comprehensive range of measurement functions series and parallel resistance Rac DC resistance Rdc capacitance C inductance L impedance Z phase angle dissipation factor D and quality factor Q can all be selected An internal DC bias source is provided for testing components such as electrolytic capacitors and semiconductor junctions For the un skilled user just connect the component you want to test into the test posts and the LCR meter will automatically sense the type of component being tested and display the characteristic
10. parameters and equivalent circuit on the large LCD display To get a more stable reading you can use the averaging function For fast comparison of components the 4270 also offers a deviation mode Select the current voltage monitoring function to see the actual test current and voltage values measured at the component under test This ensures maximum protection for current sensitive components and allows the test current to be specified together with the measured component parameters Connection of test components is quick and simple either directly to the detachable test posts which are conveniently located on the front panel or using the 9542A universal test adapter The optional 9541B test cable with Kelvin clips provides a unique solution for flexible attachment to mounted components while retaining the extra accuracy of the 4 wire measurement principle Surface mount devices SMDs are also handled quickly and efficiently using the optional SMD accessories All measurements are made using a 4 wire technique which ensures accurate and repeatable measurements even for low impedance components Testing surface mount devices has always been a challenge because of their size no wire leads and tiny or no markings These factors make it more important to be able to test SMD components to control their quality and prevent misloads in a manufacturing environment The Wayne Kerr accessories for SMD testing are uniquely designed and a
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