Basic RF Testing of CCxxxx Devices
Contents
1. www ti com INSTRUMENTS Testing Reminders 9 Testing Reminders These reminders are presented as general considerations for all users regardless of the testing setup used in a given situation 1 The SMA cable connecting the EM to the signal analyzer should have a 50 Q termination so it matches with the 50 Q of the SMA port from the EM 2 The RX board must be shielded 3 Good tests for the shielding while executing the sensitivity test are to increase the attenuation by 20 dB to 40dB beyond the sensitivity stated in the product data sheet If the RX is able to pick up the TX signal the shielding must be improved 4 When performing these tests it is better to keep the output power of the TX and INT radios at approximately 0 dBm and use attenuation provided by different attenuators 5 In the interference signal setup it is better to correlate the TX and INT outputs by simply turning off the other output and checking the RSSI at the RX end These tests should be performed with the transmitters in continuous transmit mode 6 RF couplers are asymmetric The attenuation associated with the lossy path should be factored in If a splitter that is a combiner is used it should be symmetric with equal attenuation on both paths 7 The interference signal should be in continuous transmit mode 8 Ifthe carrier is unmodulated the resulting difference in output power between the TX and INT indicates the blocking 9 Ifthe carrier2. Avionics and Defense www ti com space avionics defense Power Mgmt power ti com Transportation and www ti com automotive Automotive Microcontrollers microcontroller ti com Video and Imaging www ti com video RFID www ti rfid com Wireless www ti com wireless apps RF IF and ZigBee Solutions www ti com lprf TI E2E Community Home Page e2e ti com Mailing Address Texas Instruments Post Office Box 655303 Dallas Texas 75265 Copyright 2011 Texas Instruments Incorporated
3. I TEXAS www ti com INSTRUMENTS Receive Testing Without LabVIEW Procedure Step 1 Connect the instruments and test board as shown in Figure 12 Step 2 The TX and RX boards must be set up as for the sensitivity test Step 3 The INT interference signal is set up as for TX however the frequency can be different than that of either the TX and RX signals unless testing for co channel interference Furthermore unlike the TX that transmits packets the INT transmits continuously that is it is a continuous modulated signal Step 4 Set the output power of the TX such that the received power at the RX end is 10 dB above the sensitivity threshold obtained from sensitivity testing Remove 10 dB of attenuation from the attenuators after completing the sensitivity test Step 5 Set the output power low for the INT initially and perform the sensitivity test at the RX Step 6 Continue to increase the output power of the INT until the PER is greater than 1 The difference between the TX and INT power measured on the RX side indicates the ability of the CCxxxx device to overcome interference Table 13 Adjacent Channel Test Results Design Specification Channel Frequency MHz Difference dB dB Pass Fail Table 14 Alternate Channel Test Results Design Specification Channel Frequency MHz Difference dB dB Pass Fail Test Results SWRA370 August 201 1 Basic RF Testing of CCxxxx Devi
4. RF Testing of CCxxxx Devices SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated ld TEXAS INSTRUMENTS www ti com Receive Testing with LabVIEW 7 3 Adjacent Alternate Channel Purpose This test verifies that the minimum jamming resistance levels conforms to the published standard Example 2 Consider the 802 15 4 standards The adjacent channel Figure 16a is one on either side of the desired channel that is closest in frequency to the desired channel and the alternate channel Figure 16b is one channel removed from the adjacent channel Desired Alternative Desired Adjacent 2450 2455 MHz 2450 2455 2460 MHz a b Figure 16 IEEE 802 15 4 Standard for Adjacent Alternate Channels Pass Condition Adjacent Channel Rejection Alternate Channel Rejection 0 dB 30 dB SWRA370 August 2011 Basic RF Testing of CCxxxx Devices Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated 25 I TEXAS INSTRUMENTS Receive Testing with LabVIEW www ti com Test Environment Figure 17 illustrates the adjacent alternate channel test setup for LabVIEW C O Ext1In RF Generator RF Generator C O Ext1In PC with LabView installed SmartRF Eval Board and Eval Module 1 3 dB loss in signal on each input path through the combiner Figure 17 Adjacent Alternate Channels Test Setup for LabVIEW 26 Basic RF Testing
5. SWRA370 August 2011 Submit Documentation Feedback Basic RF Testing of CCxxxx Devices Copyright 2011 Texas Instruments Incorporated 23 I TEXAS INSTRUMENTS Receive Testing with LabVIEW www ti com 7 2 Maximum Input Power Purpose To verify that the receiver maximum input power level conforms to the published data sheet specifications Pass Condition See respective standards document for specifications and pass conditions Test Environment Figure 15 illustrates the test setup RF Generator C O Ext1In PC with LabView installed SmartRF Eval Board and Eval Module Figure 15 Maximum Input Power Test Setup for LabVIEW Procedure Step 1 Connect the instruments and test board as shown in Figure 15 Step 2 Set the EM in Packet RX mode through SmartRF Studio Step 3 Using LabVIEW send 1000 packets at a specified data rate from the RF generator controlling the received signal power Start 10 dB below the stated saturation level of the device Step 4 Measure the actual number of packets received Step 5 Calculate the PER If the PER is less than 1 repeat the test with reduced signal power When the PER 2 1 the previous signal power with a PER less than 1 indicates the sensitivity Table 19 Maximum Input Power with LabVIEW Test Results Design Specification Maximum Input Power dBm PER lt 1 dBm Pass Fail Freq 1 MHz Freq 2 MHz Freq 3 MHz Test Results 24 Basic
6. TX or packet RX tab and select an appropriate packet format Step 3 Start up the receivers first Ensure that the Seq number included in payload box is checked enabled Step 4 Start the transmitter by clicking Start Step 5 The RSSI readout on the RX side provides a relative indicator of the signal strength Step 6 The PER is calculated using this formula PER No of packets lost Total number of packets x 100 Step 7 Increase the attenuation until the PER reaches 1 This level defines the sensitivity threshold Table 12 Receiver Sensitivity Test Results Design Specification Sensitivity dBm PER lt 1 dBm Pass Fail Freq 1 MHz Freq 2 MHz Freq 3 MHz Test Results 6 2 Interference Testing Purpose To verify that the receiver sensitivity conforms to the published standards Pass Condition See respective standards document for specifications and pass conditions Test Environment Figure 12 illustrates the interference test setup Variable Attenuator SmartRF Eval Board and Eval Module Interference Source Variable Attenuator i Combiner SmartRF Eval Board and Eval Module TX PC with SmartRF Studio installed Shielded Box 1 3 dB loss in signal on each input path through the combiner Figure 12 Interference Testing Setup 18 Basic RF Testing of CCxxxx Devices SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated
7. e eee eeeee eee e ee eeeeeeeeeeneneeseeeeaaanaes 28 23 Hardware Tests with LabVIEW SumMMary sccsiccnc coeds cceetieecevextvesavsenedeweduemeveesreredceeeaiateweewerasees is 29 24 Standby Mode Test Results with LabVIEW ccc cccccc cece eee ee eee e ene n ENRERE eees 30 25 Idle Mode Test Results with LabVIEW ccc cccce eee e eee e ener e eee eee enn eee e eee eens 30 26 Power Down Mode Test Results with LabVIEW ccc cece cecce ene e ee eee nee eeeeeeneeeeeeenneeseeenneeeseaanneees 30 27 TA Mode Test Resulis With LabVIEW scsccsctitacaviewsunseaicovddenacsiusonsvesdadsidsesdsmnds nes dadaan 30 28 RX Mode Test Results with LabVIEW c cc ccccc eee e eee e eee e eee eee een e eee Sennen ees 30 SWRA370 August 2011 Basic RF Testing of CCxxxx Devices 3 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated I TEXAS INSTRUMENTS Introduction www ti com 1 Introduction This document provides the user of Texas Instruments low power RF products with an overview of the different characterization tests conducted not radiated that are performed during the device verification process This descriptive document enables users to have a better understanding of the systems and functions and also presents general information about device testing under various conditions and parameters The document covers the basic setup of the test sys
8. example for the IEEE 802 15 4 standards requirements Figure 4 illustrates the requirements Table 6 IEEE 802 15 4 Standards Requirements Example Frequency Relative Limit Absolute Limit If fel gt 3 5 MHz 20 dB 30 dBm 2450 2455 2458 5 2460 MHz i 3 5 MHz gt Figure 4 Power Spectral Density Mask Requirements Test Environment Figure 5 shows the test setup Spectrum Analyzer PC with SmartRF Studio installed SmartRF Eval Board and Eval Module Figure 5 Power Spectral Density Mask Test Setup Procedure Step 1 Connect the instruments and test board as shown in Figure 5 Step 2 Set the EM to continuous TX mode through SmartRF Studio Step 3 Verify that the PSD mask conforms to the given standard on the spectrum analyzer Table 7 Power Spectral Density Mask Test Results Design Specification PSD Relative Limit Pass Fail Freq 1 MHz Freq 2 MHz Freq 3 MHz Test Results SWRA370 August 201 1 Basic RF Testing of CCxxxx Devices 13 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated I TEXAS INSTRUMENTS Transmission Tests www ti com 5 3 Error Vector Magnitude Purpose Transmission modulation accuracy is measured using error vector magnitude EVM EVM as illustrated in Figure 6 and Figure 7 is the magnitude of the phase difference as a function of time between an ideal reference signal and the measured transmitt
9. IEW ccc cccccce eee e cence eee eee ene n eee eee seen nnn nenin k ranra 24 16 IEEE 802 15 4 Standard for Adjacent Alternate Channels cccccccceceeeeeeeeneeeeeeeeeeeeeeeaeneeeenneeeane 25 Basic RF Testing of CCxxxx Devices SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated I TEXAS INSTRUMENTS www ti com 17 Adjacent Alternate Channels Test Setup for L bVIEW cccce cece cece ee eeee een e eee eeeeeeeee enn eeeeeeeeaanneee 26 18 Energy Detection RSSI Test Setup for LabVIEW cc ccccccc cece eee nek irr nen a eeii 28 19 Hardware Tesi Setup Tor LABVIEW cessisersansdsni vou ccna nnion EERE EREE 29 List of Tables 1 Tems and ADDrOViIatONS ssassmrisiaseienneii n a a a a a E Ea a aa 4 2 DET O ese a e EEE ES 11 3 TESUINSUUMENL IMOMMANON serrr iida n a a a a aa a 11 4 Transmission Test SUMMALY ccc cece cece eee eee eee ene nnne 12 5 Transmission POWer eS RESU erriren risna ieni AARRE AEA EKARREN AAEREN 12 6 IEEE 802 15 4 Standards Requirements Example cccccccccsnseesesenneeeeesensseeeeenaneeeosaanaeeesenuuaes 13 7 Power Spectral Density Mask Test ResultS n nunnnnnnnnnnnnnnnnnnnrnnnnnnnnnnnnnnnnnnennrnnnrnnnnrnnnnnnennnnne 13 8 Error Vector Magnitude Test ReSUNS isisisisrsririrsrisisissnteuvinkni irven iaka ea ia aa ions 14 9 Transmission Center Frequency Offset Test RESUItS ccc cece eee e eee e eee eee e eee eee ee eeeeneeeeenneeenneeeas 15 10 S
10. Power 5 2 Power Spectral Density Mask 5 3 Error Vector Magnitude 5 4 Transmission Center Frequency Offset 9 9 Spurious Emissions on Transmission 5 1 Transmission Power Purpose To verify that the transmitted output power of the DUT conforms to the standards limit Pass Condition See respective standards document for specifications and pass conditions Test Environment Figure 3 illustrates the transmission power test setup Spectrum Analyzer PC with SmartRF Studio installed SmartRF Eval Board and Eval Module Figure 3 Transmission Power Test Setup Procedure Step 1 Connect the instruments and test board as shown in Figure 3 Step 2 Set the EM to unmodulated continuous TX mode with the appropriate output power level through SmartRF Studio see Ref 10 Step 3 Measure the output power level on the spectrum analyzer to confirm the output power programmed on the EM Table 5 Transmission Power Test Results Design Specification Output Power dBm dBm Pass Fail Freq 1 MHz Freq 2 MHz Freq 3 MHz Test Results 12 Basic RF Testing of CCxxxx Devices SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated la TEXAS INSTRUMENTS www ti com Transmission Tests 5 2 Power Spectral Density Mask Purpose To verify that the PSD of the DUT is able to conform to stated conformance limits Pass Condition Refer to the respective standards document Table 6 shows an
11. ayload content of the desired signal should be a sequence specified by the relevant standard It must be identical for all transmitted packets In test cases where an interference signal is used the interference signal characteristics must be defined by the applicable standards for which the device is being evaluated 2 3 3 System Communication Overview The user can communicate with the DUT using SmartRF Studio 7 LabVIEW These programs communicates with the evaluation board over the USB interface via the Chipcon Evaluation Board Access Layer CEBAL This software library contains all the functions required to control the radio device on the EB Figure 1 illustrates the connection between a PC and the SmartRF EB Ss 9 i SmartRF Evaluation Board SmartRF Studio LabVIEW CCxxxx Transceiver CCxxxx SoC SPI Debug Interface USB MCU Windows OS SmartRF Eval Board Firmware USB Driver USB Cable Figure 1 Interface Between PC and CCxxxx EMs For proper operation of the applications that use CEBAL the board must have compatible firmware that runs on the USB MCU If the firmware is out of date SmartRF Studio 7 proposes that the user update the firmware The firmware update can be done directly in SmartRF Studio 7 SWRA370 August 2011 Basic RF Testing of CCxxxx Devices 7 Submit Documentation Feedback Copyright 2011 Texas Inst
12. c circuits often use the mechanical resonance of a vibrating piezoelectric crystal to create an electrical signal with a very precise frequency This frequency is commonly used to provide a stable clock signal for digital integrated circuits and to stabilize frequencies for radio transmitters and receivers Environmental changes in temperature humidity pressure and external vibration can change the resonant frequency of a crystal The age of a crystal also adds inaccuracies to the crystal over time Because there is always some inaccuracy in the crystals used with radios one way to correct for this error is required in order to obtain an accurate measurement of sensitivity and other parameters The carrier frequency in the chip is mathematically related to the crystal frequency For example for the CC2500 the carrier frequency is calculated as shown by Equation 1 f foARRIER 22 FREQ 23 0 Where FREQ 23 0 is the base frequency for the frequency synthesizer in increments of XOSC His However the actual crystal frequency is not the same as the stated crystal frequency as a result of the inaccuracies noted earlier Consequently we must calculate the actual crystal frequency After putting the device into unmodulated continuous TX mode with the settings found using SmartRF Studio use a spectrum analyzer to measure the exact carrier frequency coming out of the chip This measured frequency is then put into Equation 1 from the p
13. ces 19 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated I TEXAS INSTRUMENTS Receive Testing Without LabVIEW www ti com 6 3 Interference Testing with RF Generator Purpose To verify that the receiver sensitivity conforms to the published standards Pass Condition See respective standards document for specifications and pass conditions Test Environment Figure 13 illustrates the test setup for interference testing with an RF generator RF Generator O Ext1In Variable _ 1 Attenuator Combiner SmartRF Eval Board and Eval Module ia t O1 20 Sum TX C PC with SmartRF Studio installed YA SmartRF Eval Board A and Eval Module Shielded Box 1 3 dB loss in signal on each input path through the combiner Figure 13 Interference Testing with RF Generator Setup Procedure Step 1 Connect the instruments and test board as shown in Figure 13 Step 2 The TX and RX boards must be set up as for the sensitivity test Step 3 The interference signal is set up by using a continuous unmodulated signal where the frequency can be different from TX and RX unless testing for co channel interference Step 4 Set the output power of the TX such that the received power at the RX end is 10 dB above the sensitivity threshold obtained from sensitivity testing Remove 10 dB of attenuation from the attenuators after completing the sensitivity test Step 5 Set the output power low for the interf
14. ces the sleep current measurements The debugger can be disconnected from the SoC BB after the device has been set to the desired mode using SmartRF Studio The radio device remains in the active sleep state and it is possible to perform more accurate measurements A hot disconnect should not normally cause any damage to the devices SWRA370 August 2011 Basic RF Testing of CCxxxx Devices 29 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated 8 1 8 2 8 3 8 4 8 5 30 I TEXAS INSTRUMENTS Electrical Tests www ti com Standby Mode Table 24 lists the outcomes of the standby mode test Table 24 Standby Mode Test Results with LabVIEW Voltage Current mA 3 3 V Idle Mode Table 25 lists the outcomes of the idle mode test Table 25 Idle Mode Test Results with LabVIEW Voltage Current mA 3 3 V Power Down Mode Table 26 lists the outcomes of the power down mode test Table 26 Power Down Mode Test Results with LabVIEW Voltage Current mA 3 3 V TX Mode Table 27 lists the outcomes of the TX mode test Table 27 TX Mode Test Results with LabVIEW RX Mode Table 28 lists the outcomes of the RX mode test Table 28 RX Mode Test Results with LabVIEW Mode Voltage Current mA At 2 440 GHz HG 3 3 V At 2 440 GHz LG Basic RF Testing of CCxxxx Devices SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated I TEXAS
15. conditions Test Environment Figure 10 illustrates the spurious emissions test setup Spectrum Analyzer PC with SmartRF Studio installed SmartRF Eval Board and Eval Module Figure 10 Spurious Emissions Test Setup Procedure Step 1 Connect the instruments and test board as shown in Figure 10 Step 2 Set the EM to continuous TX mode with random modulated data through SmartRF Studio Set the center frequency to the desired channel frequency Step 3 Measure spurs from the minimum limit to the maximum limit of the spectrum analyzer Note that different spectrum analyzers have different maximum frequencies Up to 25 GHz is more than sufficient Table 10 Spurious Emission Test Results Channel Frequency Measured Spur Design Specification Pass Fail Test Results 16 Basic RF Testing of CCxxxx Devices SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated ld TEXAS INSTRUMENTS www ti com Receive Testing Without LabVIEW 6 Receive Testing Without LabVIEW Refer to Table 11 for a summary of the various receiver tests to be performed without using LabVIEW Table 11 Receive Test without LabVIEW Summary Section No Item Result 6 1 Receiver Sensitivity 6 2 Interference Testing 6 3 Interference Testing with Signal Generator 6 1 Receiver Sensitivity CAUTION One issue to remember with the configuration described here is that RF power can reach the rec
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17. ed ld TEXAS INSTRUMENTS www ti com Transmission Tests 5 4 Transmission Center Frequency Offset Purpose To verify that the center frequency offset is within limits Pass Condition See respective standards document for specifications and pass conditions Test Environment Figure 9 shows the setup for center frequency offset transmission testing Spectrum Analyzer PC with SmartRF Studio installed SmartRF Eval Board and Eval Module Figure 9 Transmission Center Frequency Offset Test Setup Procedure Step 1 Connect the instruments and test board as shown in Figure 9 Step 2 Set the EM to continuous TX mode through SmartRF Studio Step 3 Set the center frequency to the desired channel frequency ensure that the signal is not modulated Step 4 Measure the actual frequency on the spectrum analyzer The difference between the actual frequency and the center frequency is the frequency offset Table 9 Transmission Center Frequency Offset Test Results Design Specification Channel Frequency Frequency Offset ppm Pass Fail Test Results SWRA370 August 201 1 Basic RF Testing of CCxxxx Devices 15 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated I TEXAS INSTRUMENTS Transmission Tests www ti com 5 5 Spurious Emissions Purpose To verify that the conducted spurious emissions are within limits Pass Condition See respective standards document for specifications and pass
18. ed signal Q Magnitude Error Range of Q Ideal IQ Error Magnitude Ee g Worst Case Constellation Error Point P Error Vector Measured Signal e Measured Point bia na Ideal Reference Signal Error Phase Error Vector IQ Error Phase Figure 6 Error Vector Magnitude Figure 7 EVM and Related Quantities Pass Condition See the respective standards document for specifications and pass conditions Test Environment Figure 8 illustrates the setup for the EVM test Spectrum Analyzer PC with SmartRF Studio installed SmartRF Eval Board and Eval Module a Figure 8 Error Vector Magnitude Test Setup Procedure Step 1 Connect the instruments and test board as shown in Figure 8 Step 2 Set the EM to continuous TX mode with random modulated data through SmartRF Studio Step 3 Measure EVM with the spectrum analyzer after setting up the instrument by following the steps described in the tool user manual See Appendix A for more information Example EVM measurements on ZigBee signals using a Rohde amp Schwarz FSQ can be set up following the instructions in Ref 2 Table 8 Error Vector Magnitude Test Results Design Specification EVM at kbp s Pass Fail Freq 1 MHz Freq 2 MHz Freq 3 MHz Test Results 14 Basic RF Testing of CCxxxx Devices SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporat
19. eiver outside the path through the coaxial cable and attenuators This issue is of greater concern if the two boards are placed very close together and the receiver is operated with very good sensitivity that is low data rate and receiver bandwidth This problem is observed if the receiver can decode packets even with very high attenuation and it is not possible to find the sensitivity threshold correctly To avoid this problem one of the boards should be placed in a shielded box where the shield is grounded and the only opening in the box is a small hole for cables to exit This configuration reduces radiation to a minimum Purpose To verify that the receiver sensitivity conforms to performance standards Pass Condition See respective standards document for specifications and pass conditions Test Environment Figure 11 illustrates the test setup for receiver sensitivity Variable SmartRF Eval Board Attenuator and Eval Module TX PC with SmartRF Studio installed Shielded Box Figure 11 Receiver Sensitivity Test Setup SWRA370 August 201 1 Basic RF Testing of CCxxxx Devices 17 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated I TEXAS INSTRUMENTS Receive Testing Without LabVIEW www ti com Procedure Step 1 Connect the instruments and test board as shown in Figure 11 Step 2 Configure both the TX side and the RX side with the appropriate RF settings Select the packet
20. em configurations without LabVIEW and with LabVIEW This section briefly describes each configuration 2 3 1 1 Manual Test Systems Without LabVIEW Systems not using LabVIEW use the following test equipment and resources CCxxxx Evaluation Module SmartRF Evaluation Board one Male to Male SMA RF cable Variable attenuators two PC with SmartRF Studio software installed RF coupler combiner RF signal generator two Signal analyzer eS 2 oe Se Ye 2 3 1 2 Automatic Test Systems Using LabVIEW Systems using LabVIEW use the following test equipment and resources CCxxxx Evaluation Module SmartRF Evaluation Board one Male to Male SMA RF cable Signal analyzer PC with SmartRF Studio and LabVIEW software installed RF coupler combiner RF signal generator two oy ot P I S 6 Basic RF Testing of CCxxxx Devices SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated la TEXAS INSTRUMENTS www ti com Standards and System Requirements 2 3 2 Initial Conditions for Testing The device under test DUT is connected to the tester via a 50 Q connector If there is no antenna interface a temporary 50 Q interface or a suitable coupling device 50 Q load should be used For RX testing the input reference signal both as the desired signal and the interference signal should have certain characteristics that must be set according to the respective standards document P
21. equency MHz Difference dB dB Pass Fail Test Results SWRA370 August 2011 Basic RF Testing of CCxxxx Devices 2 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated I TEXAS INSTRUMENTS Receive Testing with LabVIEW www ti com 7 4 Energy Detection RSSI Purpose To verify that the energy detection conforms to the published data sheet specifications Pass Condition The mapping from the received power in decibels to energy detection value must be linear with a stated accuracy given in the standard Test Environment Figure 18 illustrates the energy detection test setup C O Ext1In RF Generator PC with LabView installed SmartRF Eval Board and Eval Module Figure 18 Energy Detection RSSI Test Setup for LabVIEW Procedure Step 1 Connect the instruments and test board as shown in Figure 18 Step 2 Set the EM in Packet RX mode through SmartRF Studio Step 3 Using LabVIEW send 1000 packets at a specified data rate from the RF generator and set the generator signal power Step 4 Read the RSSI value from the SmartRF Studio software interface This value should correlate to the sent signal strength Table 22 Energy Detection RSSI with LabVIEW Test Results Design Specification Power Detection dB Signal Strength dBm dBm Pass Fail Freq 1 MHz Freq 2 MHz Freq 3 MHz Test Results 28 Basic RF Testing of CCxxxx Device
22. erence signal initially and perform the sensitivity test at the RX Step 6 Continue to increase the output power of the interference signal until the PER is greater than 1 The difference between the TX and INT power measured at the RX side indicates the ability of the CCxxxx device to overcome interference 20 Basic RF Testing of CCxxxx Devices SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated la TEXAS INSTRUMENTS www ti com Receive Testing Without LabVIEW Table 15 Adjacent Channel Test Results Design Specification Channel Frequency MHz Difference dB dB Pass Fail Table 16 Alternate Channel Test Results Design Specification Channel Frequency MHz Difference dB dB Pass Fail Test Results SWRA370 August 2011 Submit Documentation Feedback Basic RF Testing of CCxxxx Devices 21 Copyright 2011 Texas Instruments Incorporated I TEXAS INSTRUMENTS Receive Testing with LabVIEW www ti com 7 Receive Testing with LabVIEW Refer to Table 17 for a summary of the various receiver tests performed with LabVIEW Table 17 Receive Test with LabVIEW Summary Section No Item Result 7 1 Receiver Sensitivity 7 2 Maximum Input Power 7a Adjacent Alternate Channel 7 4 Energy Detect 7 1 Receiver Sensitivity Purpose To verify that the receiver sensitivity conforms to the published standards Pass Condition See
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24. euwennmedasuivead A AE aa oo List of Figures 1 interlace Between PC and COOOX EMS 2 ccs crcevenst ccnp en ceceetsesanscaanbecdnesaheseddeneese oaei 7 2 Interface Between PC and Any Board with TI LPRF Radio ccccceeseeeee eee eeeeeeeeeeeeeeeeeeeeeseeeaennaes 8 3 Tranemo on FONET TESI eID iarr reini eTA EEA AEAEE AAAA AEE EEE AAR EERE 12 4 Power Spectral Density Mask ReEqQuireMent ccccceeeeeceee seen eee e eee R aa a aa 13 5 Power Spectral Density Mask Test SetUp snsnsnnsnunnnnnnnrnnnnnnrnnnnrnnnnnnnnnnnrnenrrnrnennnnrnnnnnnennnnne 13 6 EO ECO MANU ea E a E E E E EEN inom 14 7 EVM and Related Quanh ES rererua nine REO E OCEANE NEAN EN 14 8 Error Vector Magnitude Test Setup sassssssnsnunnnnnnnnnnnnrnrnnrnnnnrnnnnnnnnenennrnrnennrnrnnnnnnnnnnnnnrnnnnnn 14 9 Transmission Center Frequency Offset Test SetUp sasassssnssnrnsnnrnnnnnnennnnrnennrnrnennrnrnennrnrnennne 15 10 SDUNOUS EMISSIONS Test OCUP 421 cecccemsaccunseesewedecece cde eemeuteeuevecetensnabiuenieecercnsteceweretedndesensesess 16 11 Receiver Sensitivity Test S tup ccc ccc ccc cece eee eee eee nnn EEE eee 17 12 iitenerence Testing ells tavern ss ecu e ease EAEE EA e EEEE AEREE 18 13 Interference Testing with RF Generator S tup ccc cc cccccee eee e ene endida edia EEE 20 14 Receiver Sensitivity Test Setup for LabVIEW cc cece ccccce eens eee e cence een n eens essen nnn neeeseeeeaannnnes 22 15 Maximum Input Power Test Setup for LabV
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26. ge level on the EB usually 3 3 V For more information see Ref 11 and Ref 12 CAUTION The CC Debugger operates internally at 3 3 V However it has level converters that will detect the voltage on the target board and ensure that the debug control lines are set to a voltage that corresponds to the target I O voltage Test System Operation Use these general parameters to perform tests in TX mode when using LabVIEW e Set the DUT to TX mode using SmartRF Studio 7 e Supply and temperature are set by LabVIEW e The signal analyzer is configured by LabVIEW to measure the transmitted data e LabVIEW captures the data from the signal analyzer e The collected information then can be interpreted either in LabVIEW or other PC based software Basic RF Testing of CCxxxx Devices SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated la TEXAS INSTRUMENTS www ti com Frequency Correction Use these general parameters to perform tests in RX mode when using LabVIEW e Set the DUT to RX mode using SmartRF Studio 7 e Supply temperature are set by LabVIEW e The signal analyzer is configured by LabVIEW to transmit data continuously or in packets that adhere to standards e SmartRF Studio 7 LabVIEW captures the data from the DUT e This collected information then can be interpreted either in LabVIEW or exported to other PC based software 3 Frequency Correction Electroni
27. iation of Radio Industries and Businesses Trade association website 7 Evjen P M 2003 SRD regulations for license free transceiver operation Application report Literature number SWRAO9QO 8 Engjom M 2006 2 4 GHz regulations Application report Literature number SWRAO6O 9 Loy M Karingattil R and L Williams Eds 2005 ISM band and short range device regulatory compliance overview Application report Literature number SWRA048 10 SmartRF Studio Product folder at www ti com 11 SmartRFO5EB User s guide Literature number SWRU210 12 CC Debugger Users guide Literature number SWRU197 13 Debugger and Programmer for RF System on Chips Product folder at www ti com 14 Battery Board for Systems on Chip Product folder at www ti com 15 RF and System Basics Electronic resource htip www circuitsage com 16 Grini D 2006 RF Basics RF for Non RF Engineers Seminar presentation MSP430 Advanced Technical Conference Literature number SLAP 127 32 Basic RF Testing of CCxxxx Devices SWRA370 August 2011 ld TEXAS Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated la TEXAS INSTRUMENTS www ti com Appendix A Offset EVM vs EVM Offset EVM and EVM are both measurements of error vector magnitude in other words how far from the ideal position the actual signal position is The difference between offset EVM and EVM is when to obtain these measurements In offset EVM meas
28. is modulated the resulting difference in output power between the TX and INT indicates the selectivity 10 The shielded box can be a biscuit tin box with a small hole for the cable 11 SmartRF Studio can be used to change the frequency for running the different interference tests 12 When testing interference on IEEE 802 15 4 systems using an RF generator if a modulated carrier is used use a continuous MSK 2 Mbps modulated carrier 13 The adjacent channel rejection ACR measurement on IEEE 802 15 4 systems is described in Ref 1 14 Keep the cables attenuators connectors clean Otherwise losses in the cables can be excessive SWRA370 August 2011 Basic RF Testing of CCxxxx Devices 31 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated INSTRUMENTS References www ti com 10 References Unless otherwise indicated the following references are available for download at the Texas Instruments website www ti com 1 Wium E 2009 ACR measurements on IEEE 802 15 4 systems Application report Literature number SWRA255 2 EVM measurements on ZigBee signals 2005 News from Rohde amp Schwarz 185 1 Product information bulletin 3 Engjom M 2006 Practical sensitivity testing Application report Literature number SWRAOQ7 4 European Telecommunications Standards Institute European government regulatory commission 5 Federal Communications Commission U S government regulatory commission 6 Assoc
29. mission of electrical networks are easy to measure at high frequencies but there are other network parameter sets such as y parameters Z parameters and h parameters Network analyzers are often used to characterize two port networks such as amplifiers and filters they can also be used on networks with an arbitrary number of ports It is useful to have one network analyzer available e Oscilloscope This electronic test instrument allows users to observe constantly varying signal voltages usually as a two dimensional graph of one or more electrical potential differences with a vertical or Y axis plotted as a function of time horizontal or x axis Although an oscilloscope displays voltage on the vertical axis any other quantity that can be converted to a voltage can be displayed as well In most instances oscilloscopes show evenis that repeat with either no change or that change slowly Having an oscilloscope is useful for a test system The more equipment one has in the test configuration the greater need there is to automate the various testing processes For an elaborate setup then one should use a platform such as LabVIEW and write specific application routines to enable the different test equipment to interface together Keep in mind that the capabilities of the available equipment used in a given test system will likely limit the types of testing that can be performed 2 3 1 System Setup This document describes two types of test syst
30. nment for a visual programming language from National Instruments The graphical language is named G Originally released for the Apple Macintosh in 1986 LabVIEW is commonly used for data acquisition instrument control and industrial automation on a variety of platforms including Microsoft Windows various versions of Unix Linux and Mac OS X This software is used as a platform to automate the entire test system e SmartRF Studio SmartRF Studio see Ref 10 is a Windows based application that can be used to evaluate and configure low power RF ICs from Texas Instruments This tool helps RF system designers to quickly and easily evaluate the respective devices at an early stage in the design process lt is especially useful for generation of configuration register values for practical testing of the RF SWRA370 August 2011 Basic RF Testing of CCxxxx Devices 5 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated I TEXAS INSTRUMENTS Standards and System Requirements www ti com system and for finding optimized external component values SmartRF Studio can be used either as a standalone application or together with some evaluation boards that are shipped in RF IC development kits e Network analyzer vector network analyzer This tool is an instrument that measures the network parameters of electrical networks Contemporary network analyzers usually measure s parameters because reflection and trans
31. nstruments 2 3 Test System Requirements Any characterization test system has some generic components and additional specialty engineering customization A typical test system generally consists of these components and subsystems e Signal analyzers spectrum analyzers These tools are widely used to measure the frequency response noise and distortion characteristics of all types of RF circuitry These devices compare the input and output spectra under a variety of conditions A typical test system usually requires only one signal analyzer e Signal generators These devices generate repeating or non repeating electronic signals in either the analog or digital domain A typical system should have at least two signal generators one to generate the primary signal the second to generate an interference signal The CC devices from TI can be used as a signal source in some lab setups However the power resolution may not be as good as that produced by a signal generator e Temperature chamber An enclosure used to test the effects of specified temperature conditions on a series of test devices A single temperature chamber should be sufficient for most test systems e Connectors cables splitters These components connect different signals using coaxial cable from the test system to and from the device under test DUT e LabVIEW LabVIEW or Laboratory Virtual Instrumentation Engineering Workbench is a software platform and development enviro
32. of CCxxxx Devices SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated ld TEXAS www ti com INSTRUMENTS Receive Testing with LabVIEW Procedure Step 1 Connect the instruments and test board as shown in Figure 17 Step 2 Set the EM in Packet RX mode through SmartRF Studio Step 3 Set the output power of the first generator such that the received power at the EM end is at 3 dB greater than the minimum sensitivity obtained from sensitivity testing for LabVIEW Step 4 Using LabVIEW send 1000 packets at a specified data rate from one of the RF generators controlling the received signal power Step 5 Using LabVIEW set the frequency and power of the interference signal on the second generator to the adjacent alternate channel Step 6 Set the output power ow for the interference signal Second generator initially then perform the sensitivity test at the EM Step 7 Continue to increase the output power of the interference signal until the PER is greater than 1 The difference in the first and second generator power as seen on the EM side indicates the ability of the device to overcome interference and is the adjacent alternate channel rejection Table 20 Adjacent Channel with LabVIEW Test Results Design Specification Channel Frequency MHz Difference dB dB Pass Fail Table 21 Alternate Channel with LabVIEW Test Results Design Specification Channel Fr
33. of inaccuracies the actual crystal frequency is 26 108 MHz Therefore the signal generator and signal analyzer must be set to frequencies calibrated from the true crystal frequency 10 Basic RF Testing of CCxxxx Devices SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated la TEXAS INSTRUMENTS www ti com 4 DUT and Test Instrument Information This page and subsequent pages can be printed and used as a record for the details of the respective test setup 4 1 DUT Table 2 shows the generic DUT information Product Model Name Hardware Version Host Interface Type Module SN 4 2 Test Instruments Table 2 DUT Information DUT and Test Instrument Information Table 3 lists the general test instrument data See Section 2 3 for more information Table 3 Test Instrument Information Item Vendor Model Name Quantity Signal generator Power combiner Spectrum analyzer Power meter Attenuator Temperature chamber Oscilloscope Network analyzer SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated Basic RF Testing of CCxxxx Devices 11 I TEXAS INSTRUMENTS Transmission Tests www ti com 5 Transmission Tests Refer to Table 4 for a summary of the various transmission tests Table 4 Transmission Test Summary Section No Item Result 5 1 Transmission
34. purious Emission Test RESUItS ccc cece cece ee eee eee Een 16 11 Receive Test without LabVIEW SUMMON sisscccsecceceedicextensewes scaeesdeweednewexeracesesesoenivdewecedeaensias 17 12 Receiver Sensilivily Test RESUS vcerecsusnenencetveceeeweseecenettnddeseevenewecenehcuedeeserexesccadenenewmieeseentens 18 13 Adjacent Channel Test Results sess svscvessa da deachonsedsueaeseindscatecasseseneesesdeneassieeusseadseadcneccteteedees 19 14 Plkernate Channel Nest Mes US teseavceverecteseeravasveusedaste E e ea EENEG 19 15 Adjacent Channel Test RESUNS wrevacecasccanendanctcecaseecekcanedenscuineoncscedteesvasnwsdtonenstciesdsneaewaee ued see 21 16 Alternate Channel Test Results nannsnsnnnnnnnnnnnnnnnnnrnennnnnnnnnnnrnennrnenennrnrnnnnnnennnnrnennnnnnnnnnnen 21 17 Receive Tesi with Lab VIEW SUumMMaly wncccccscedicereresseetnerecedcesegseneseteecuausatecaveredesusiacexeeeddesseseks 22 18 Receiver Sensitivity with LabVIEW Test R SUItS cc ccccceee eee e eee e eee eeeee eee n eee eeeeeeee nn nneeeeeseeaaennnes 23 19 Maximum Input Power with LabVIEW Test Results cccccceeeeeeee eee eeeneeeeeneeseneeeennnesseeneseenneseaes 24 20 Adjacent Channel with LabVIEW Test Results ccc cc cecccee seen eee e eee eeee ene n eee e ee aaea 27 21 Alternate Channel with LabVIEW Test Re SUItS ccccccccccee seen eee e eee eeee eee n eee eeeeeeeenneneeeeeseeeannnaes 27 22 Energy Detection RSSI with LabVIEW Test Results cccccesc cece eee
35. r Application Report I TEXAS SWRA370 August 2011 INSTRUMENTS Basic RF Testing of CCxxxx Devices Abhishek Chattopadhyay Low Power RF Products ABSTRACT This document presents users of Texas Instruments low power RF products with an overview of the different characterization tests conducted not radiated that are performed during the device verification process The document covers the basic setup of the test system and gives procedural information about each test Throughout this document the term CCxxxx refers to the low power CC25xx CC11xx CC10XX and CC24xx RF device families Keywords e RF Testing e RX Test e Conformance Testing e Output Power e SmartRF Studio e TX Test e Characterization Test e Sensitivity SmartRF is a trademark of Texas Instruments Apple Macintosh are registered trademarks of Apple Inc Bluetooth is a registered trademark of Bluetooth SIG Linux is a registered trademark of Linus Torvalds Microsoft Windows are registered trademarks of Microsoft Corporation LabVIEW is a trademark of National Instruments ZigBee is a registered trademark of Zigbee Alliance All other trademarks are the property of their respective owners SWRA370 August 201 1 Basic RF Testing of CCxxxx Devices 1 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated I TEXAS INSTRUMENTS www ti com Contents 1 IMMOCUCHON vaeresianticneiacdseloiricevaiatocdiaeir ee te eisai tcoyod event eh
36. respective standards document for specifications and pass conditions Test Environment Figure 14 illustrates the test setup for receiver sensitivity with LabVIEW C O Ext1In RF Generator PC with LabView installed SmartRF Eval Board and Eval Module Figure 14 Receiver Sensitivity Test Setup for LabVIEW 22 Basic RF Testing of CCxxxx Devices SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated la TEXAS INSTRUMENTS www ti com Procedure Receive Testing with LabVIEW Step 1 Connect the instruments and test board as shown in Figure 14 Step 2 Set the EM in Packet RX mode through SmartRF Studio Step 3 Using LabVIEW send 1000 packets at a specified data rate and modulation format from the RF generator while controlling the generator power Start 10 dB over the stated sensitivity of the device Step 4 Measure the actual number of packets received Step 5 Calculate the PER If the PER is less than 1 repeat the test with a reduced signal power When the PER 2 1 the previous signal power with a PER less than 1 indicates the sensitivity NOTE See Ref 3 for more detailed techniques to test TI CCxxxx devices for sensitivity Table 18 Receiver Sensitivity with LabVIEW Test Results Sensitivity dBm PER lt 1 Design Specification dBm Pass Fail Freq 1 MHz Freq 2 MHz Freq 3 MHz Test Results
37. roduct data sheet and one solves for fyose This result is the actual crystal frequency for the specific DUT that can then be used to determine the exact carrier frequency across the band In the CC253x CC254x devices the FREQTUNE register is used to tune the crystal oscillator The default setting 1111 leaves the XOSC not tuned Changing the setting from default switches in extra capacitance to the oscillator effectively lowering the XOSC frequency As a result the final crystal frequency can be controlled by adjusting the value of the FREQTUNE register in these devices SWRA370 August 2011 Basic RF Testing of CCxxxx Devices 9 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated I TEXAS INSTRUMENTS Frequency Correction www ti com Example 1 Calculate the actual crystal frequency for a particular carrier frequency based on the known crystal frequency Assume a 26 MHz crystal for a CC2500 device The carrier frequency is set to 2 4 GHz using these register settings e FREQ2 23 16 0x5C e FREQ1 15 8 0x4E e FREQO 7 0 0xC4 e FREQ 23 0 0x5C4EC4 e FREQ 6049476 hex to dec conversion If the measured carrier frequency is 2 41 GHz then the actual crystal frequency can be calculated using Equation 1 Solving for fyos produces these results 16 foaRRIER 2 f one Eo f 25 ee cas 6049476 frose 26 108 MHz Even though the crystal is rated at 26 MHz as a result
38. ruments Incorporated 2 3 4 I TEXAS INSTRUMENTS Standards and System Requirements www ti com It is possible to connect your own hardware to the SmartRF Evaluation Board to test your own radio design with SmartRF Studio7 LabVIEW Connect the board to the TI evaluation board via the breakout pins on the EB or use the target connector on the CC Debugger For SoCs use the debug interface for transceivers use the serial peripheral interface SPI Figure 2 shows the connection between a PC and a generic evaluation board with a TI LPRF radio Ss 9 Wi Any board with TI LPRF Radio SmartRF Studio LabVIEW Note 1 SmartRF Evaluation Board or CC Debugger Windows OS ec ec ec ee USB MCU CEBAL Firmware USB Driver USB Cable 1 Connect the board to the TI evaluation board via the break out pins on the board or user the target connector on the CC Debugger For SoCs use the debug interface for transceivers use the SPI interface Refer to the evaluation board user guide for more details Figure 2 Interface Between PC and Any Board with TI LPRF Radio In all cases make sure that the boards are properly connected and that the voltage levels are correct These cautions are especially relevant if you are not using level shifters and the voltage level on your board is different from the volta
39. s SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated la TEXAS INSTRUMENTS www ti com Electrical Tests 8 Electrical Tests Table 23 summarizes the various electrical tests performed with LabVIEW Table 23 Hardware Tests with LabVIEW Summary Section No Item 8 1 Standby mode RF disable mode 8 2 Idle mode 8 3 Power Down mode 8 4 TX mode 8 5 RX mode Test Environment Figure 19 illustrates the test setup for all hardware tests Multimeter Power Supply PC with SmartRF Studio installed SoC BB and Eval Mod CC Debugger Figure 19 Hardware Test Setup for LabVIEW Procedure Step 1 Connect the instruments and test board as shown in Figure 19 Step 2 The test requires the use of a SoC BB for accurate measurement see Ref 14 Step 3 Mount the CCxxxx EM on the SoC BB Step 4 Supply power to the board from an external supply rather than AA battery cells Step 5 Connect a multimeter in series with the supply line Step 6 Connect the CCDebugger see Ref 13 to the SoC BB to enable communication with the CCxxxx EM Step 7 Use SmartRF Studio to set the device to the proper modes Step 8 Set the supply to 3 3 V Step 9 Measure the current on the multimeter for each mode CAUTION The CC Debugger influences the measurements The debugger consumes some current and increases the measured current going into the EM In particular this device influen
40. space applications or environments unless the TI products are specifically designated by TI as military grade or enhanced plastic Only products designated by TI as military grade meet military specifications Buyers acknowledge and agree that any such use of TI products which TI has not designated as military grade is solely at the Buyer s risk and that they are solely responsible for compliance with all legal and regulatory requirements in connection with such use TI products are neither designed nor intended for use in automotive applications or environments unless the specific TI products are designated by TI as compliant with ISO TS 16949 requirements Buyers acknowledge and agree that if they use any non designated products in automotive applications TI will not be responsible for any failure to meet such requirements Following are URLs where you can obtain information on other Texas Instruments products and application solutions Products Applications Audio www ti com audio Communications and Telecom www ti com communications Amplifiers amplifier ti com Computers and Peripherals www ti com computers Data Converters dataconverter ti com Consumer Electronics www ti com consumer apps DLP Products www dip com Energy and Lighting www ti com energy DSP dsp ti com Industrial www ti com industrial Clocks and Timers www ti com clocks Medical www ti com medical Interface interface ti com Security www ti com security Logic logic ti com Space
41. tem and gives procedural information about each test Texas Instruments low power RF products make it easier to build wireless links for remote control metering and sensing applications In most cases they are used inside unlicensed or license free wireless products Unlicensed means only that the user of these products does not need an individual license from the telecommunication regulatory authorities Unlicensed does not mean unregulated the wireless product itself must usually meet strict regulations and be certified by the appropriate regulatory authorities The different international regulatory authorities such as the FCC ETSI and ARIB regulate the use of radio receivers and transmitters These bodies maintain specifications that must be met by all devices for each of the tests mentioned in the application report Refer to the respective standards document see Section 2 1 1 1 Abbreviations Table 1 lists many of the terms and abbreviations used in this document Table 1 Terms and Abbreviations Abbreviation Acronym Definition Meaning ARIB Association of Radio Industries and Businesses CEBAL Chipcon Evaluation Board Access Layer dBm Power ratio in decibels dB of the measured power referenced to 1 mW DUT Device under test EB Evaluation board EM Evaluation module ETSI European Telecommunications Standards Institute EVM Error vector magnitude FCC Federal Communications Commission FSQ Full spectrum quantization GUI Graphical user in
42. terface IEEE Institute of Electrical and Electronics Engineer INT Interference source interference signal ISM Industrial scientific medical MSK Minimum shift keying PER Packet error rate PSD Power spectral density RSSI Received signal strength indicator RX Receive receiver SMA Sub Miniature version A connector SoC System on chip SPI Serial parallel interface TX Transmit transmission transmitter 4 Basic RF Testing of CCxxxx Devices SWRA370 August 2011 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated I TEXAS INSTRUMENTS www ti com Standards and System Requirements 2 Standards and System Requirements 2 1 Standards The following standards serve as references for the tests described in this document All electronic links are current at the time of document publication e Bluetooth Low Energy RF PHY Standard e ZigBee RF4CE Standard e Zigbee Standard e FCC Section 47CFR15 Part 15 Standard e ETSI EN 300 440 Standard e ETSI EN 300 220 Standard e IEEE 802 15 4 Standard e ARIB T 66 Standard 2 2 Test Equipment Suppliers The different test equipment used to perform the various procedures described in this document can be procured from the following suppliers Obtaining some of this equipment may require going through an agent All electronic links are current at the time of document publication e Rohde amp Schwarz e Agilent e Anritsu e Tektronix e Test Equity e National I
43. this information with alteration is an unfair and deceptive business practice TI is not responsible or liable for such altered documentation Information of third parties may be subject to additional restrictions Resale of Tl products or services with statements different from or beyond the parameters stated by TI for that product or service voids all express and any implied warranties for the associated TI product or service and is an unfair and deceptive business practice TI is not responsible or liable for any such statements Tl products are not authorized for use in safety critical applications such as life support where a failure of the TI product would reasonably be expected to cause severe personal injury or death unless officers of the parties have executed an agreement specifically governing such use Buyers represent that they have all necessary expertise in the safety and regulatory ramifications of their applications and acknowledge and agree that they are solely responsible for all legal regulatory and safety related requirements concerning their products and any use of TI products in such safety critical applications notwithstanding any applications related information or support that may be provided by TI Further Buyers must fully indemnify TI and its representatives against any damages arising out of the use of TI products in such safety critical applications Tl products are neither designed nor intended for use in military aero
44. urements calculate the EVM for the in phase I portion of the signal at the start of the symbol and the quadrature phase Q portion at the middle of the symbol Using this approach users can obtain the EVM at the actual decision points that the demodulator makes when trying to decode it This method is the correct way to measure EVM because it reflects the actual demodulator in the CCxxxx devices For a perfect signal it does not matter if you use offset EVM or EVM For spectrums where the and Q phases are more noisy in the respective transitions than at the decision points performing a regular EVM measurement gives you a poorer result but does not affect the ability to receive the signal SWRA370 August 2011 Basic RF Testing of CCxxxx Devices 33 Submit Documentation Feedback Copyright 2011 Texas Instruments Incorporated IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries Tl reserve the right to make corrections modifications enhancements improvements and other changes to its products and services at any time and to discontinue any product or service without notice Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete All products are sold subject to Tl s terms and conditions of sale supplied at the time of order acknowledgment Tl warrants performance of its hardware products to the specifications applicable at the time o
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