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SunShine Optical simulator User`s manual

1. Selecting a spectrum By clicking the down arrow on the right side of the text box available spectrums that are listed in lt workdir gt List Spectrum dat are shown You can select one of these spectrums or write the name of another spectrum directly in the box In this case be sure that there exists the_name spk file with corresponding spectrum in lt workdir gt Spectrum folder NOTE The discrete wavelengths specified in the spectrum file determine the discrete wavelengths in which the simulation is carried out Thus for each discrete wavelength presented in the spectrum there should be defined complex refractive index in nk files for all layers used in the simulation Advance Settings By clicking the button Show Advanced settings following two options are possible to be selected e Direct coherent light applied perpendicular to the structure e Combination of perpendicular coherent specular light and incoherent diffused light Direct coherent light applied perpendicular to the structure By selecting this option the illumination spectrum consists only of coherent specular light applied perpendicularly to the structure Combination of perpendicular coherent specular light and incoherent diffused light 3f SunShine v1 2 8 Optical Simulator User s manual By selecting this option the illumination spectrum is divided into two parts direct illumination and diffused illumination The sum of both components is equal to the in
2. Advanced Settings By clicking the button Show Advanced settings following option is possible to be included Use other ADFs for specified interfaces groups By including this setting you can apply other different ADFs to specified group of interfaces In this version it is possible to include up to 15 interface groups with different ADF settings For each interface group you can specify one or more interfaces to which the selected ADFs are applied to see below It has to be mentioned that the ADFs defined in the basic settings apply to all interfaces except the ones defined in the advanced settings if switched on for these interfaces the basic ADF settings are overwritten with the new ones defined here If one or more interfaces are by mistake present in different ADF interface groups the settings corresponding to a higher ADF group number are considered Details are explained in the picture below switch on off other ADF settings move to a higher up or lower down interface group MV Use other ADFs for specified interface groups Apply to selected interfaces ADF interface group 1 TES i e g 0 1 4 0 front interface add new group delete the selected group specify the interfaces to which at the end and shift all succeeding for the ADFs selected below will be 1 number lower applied to In the lower part of the window you can select the ADFs internal or external as in the case of the basic ADF settings
3. Ellipsis dependent on incident angle 3D Equal in all directions Equal in all directions 3D Linear Linear 3D Linear dependent on incident angle 24 SunShine v1 2 8 Optical Simulator User s manual e Linear dependent on incident angle 3D In case that any other specific ADF2 is activated check the list of available internal ADF2s by clicking the down arrow at the right side of the ADF selection box please contact authors janez krc fe uni lj si for additional information All options for selection of ADF1 are included also here Since ADF2 in general depends on incident angle of the illumination beam 4 new options are added to the internal ADF2 selection denoted with dependent on incident angle For these options dependency on incident angle is included In this case also an additional ADF transformation besides ADF3p ip related to spherical symmetry of incident illumination resulting in a cone instead of one beam illumination is taken into account in the simulator For the information on this transformation refer to the documentation on Scattering parameters Specular direction incoherent The same as in case of ADF 1 refer to description of this option in ADF1 section Lambertian cos n Lambertian cos n 3D The same as in case of ADF 1 refer to description of this option in ADF1 section Ellipsis Ellipsis 3D The same as in case of ADF1 refer to description of this option in A
4. SunShine v1 2 8 Optical Simulator User s manual Example Reference structure air i a Si H d 100 nm i a Si H infinite to avoid back reflection Improved structure air i a Si H d 200 nm i a Si H infinite to avoid back reflection Result LPIF 200 nm 100 nm 2 0 In general LPIF is wavelength dependent The definition of the LPIF in the transform is as follows ml 1 0 wp Tud Lu 0 d LPIF init dere effective equivalent thickness of the layer in the improved structure caused not necessarily due to the actual thickness prolongation but sue to improved improved light trapping scattering dinit actual thickness of the layer in the reference structure I d total light intensity including forward and backward going waves and rays interferences at the end of the layer 1 0 total light intensity including forward and backward going waves and rays interferences at the entrance of the layer Tnit d and Tipi O0 total light intensities in the layer in the reference structure The natural logarithm functions originates from the natural logarithmic dependency d I or in other words d is following the exponential relation to d I d I 0 exp ad where is the absorption coefficient of the layer at a given wavelength In the following the interface of the Calculate LPIF tool is exolained Select the _ratio jph file of the reference st
5. which should end with a colon before number is given Each sr roughness has to be specified Wow above corresponding cT cR column after sign The order of the columns has to be as follows 1 lambda wavelength in nanometers 2 cT or cR in case of cR files values for corresponding rms roughness sr 3 and rest cT or cR in case of cR files values for the next rms roughnesses sr The decimal separator for all numbers should be dot The numbers can include more than one decimal places The separators between columns can be either spaces or tabulators The file ends with the last data of the columns Note If certain cal file is included in the simulation all the discrete wavelengths of the selected input spectrum should be represented also in the cal file while for the roughnesses linear interpolation between the specified sr values is used in the simulator 41 SunShine v1 2 8 Optical Simulator User s manual bre files Total reflectance calibration function or total reflectance directly see description of Total reflectance and transmittance console Advanced settings from the front side of the interface c12 as a function of discrete wavelength and rms roughness sr as a parameter are given in bre files c12 values should be in the interval between 0 and 1 The structure and requirements of the files are explained on the following example of BRcor_08_09 cal file only the first pa
6. 0z2 9 518439e 02 501006e 06 5 556540e 07 7 5596359e 04 1l25265e 02 4 031203e 02 9 115545e 02 1 501006e 06 5 576978e 07 7 203652e 04 1 073278e 02 4 424515e 02 8 726358e 02 1 501007e 06 5 308866e 07 6 862656e 04 1 023523e O02 4 226076e O2 8 355676e 02 501008e 06 5 051408e 07 6 535602e 04 9 758408e 03 4 037150e 02 8 000394e 02 1 501008e 06 4 803830e 07 6 241479e 04 9 30083 6e 03 3 855354e 02 7 659472e 02 The structure of the file is equal to the one in G1 file refer to description of GI files with following exception light intensity is specified at each discrete calculation point in the structure The corresponding absolute position x of each discrete calculation point is given The specified intensities correspond exactly to these positions NOTE For accurate representation of light intensity profile across the structure sufficient number of calculation points No of Segm has to be defined for the layers in the Structure console y jsc file The file contains simulation results of short circuit current densities Jsc lt photo gt as a function of discrete wavelength In such a way the contribution of specific wavelength to the common Jsc lt photo gt is indicated For determination of the Jsc lt photo gt values from optical simulations refer to Results section 50 SunShine v1 2 8 Optical Simulator User s manual The structure of the file is the same as in case of rta file refer to the description of rta f
7. 90 degrees to 3 the equivalent angular step is 90 degrees 3 30 degrees as shown in the following figure M 3 30 30 30 19 SunShine v1 2 8 Optical Simulator User s manual By assuming the spherical symmetry the description for this angular range is valid also in the range from 90 to 0 degrees The default and advised value for No of equivalent angles per 90 degrees is 45 In the following subsections the settings for ADF1 and ADF2 are described ADF1 corresponds to the case of perpendicular incidence of coherent specular light whereas ADF corresponds to the incidence of incoherent scattered diffused light beam at a rough interface Settings for ADF1 Two options are possible to define ADF 1 of the rough interfaces inside the structure e Use internally defined ADF1 e Use externally defined ADF1 Use internally defined ADF1 Internally defined ADFls are pre determined inside the model For some internal ADF1s external parameters that can be defined by the user Internal ADF1 is defined for reflected ADF1R and transmitted light ADF1T scattered at rough interfaces Selection in the console can be made by clicking the down arrow on the right side of the boxes for specifying ADF1R upper box and ADF1T bottom box In both cases one can choose between following 9 basic predefined ADF 1s Specular direction incoherent Lambertian cos n Lambertian cos n 3D Ellipsis Ellipsis 3D Equal in
8. P ALAIN CLE TSA wate ii nis wietacedeavinarth enue cacstantarenrnadeed seca enue ots 17 2 4 Angular Distribution FUNCTION 0 c cece cceeeeceteeeeeeeeees 19 2 5 Total Reflectance and Transmittance 0 cece ceteeseeeees 28 2 6 Illumination Spectrum 2 2 0 c ecesdscetiecstevectiene eceenssstdeneties 31 2K SACS ess e a si datenn tse regan etaha nice E 32 2 8 Additional Comments SettingS ececceeeeseeceeneceeenteeeeeeeeees 34 2 9 EEOCESS W INCOW 13 9 00s si shar ane d lonieaae eel Saas sey ioeoe 34 2310 Results eana a E ue aamaies 35 3 DESCRIPTION OF FILES eeeesesesesesessoscseseososcscsesesssesessososeseseese 39 JA 81101510 fc ae aiaa 39 3 2 Q tput ECS 2 tac thot lace tet acta ta ce aha i EE 47 4 SIMULATION EXAMPLE s sesesessosososessososcseseseseseosososcseosososesesess 54 Appendix 1 Numerical methods used in Optimo 0000 63 Appendix 2 Installation of FT DI drivers scccssssssseee 66 SunShine v1 2 8 Optical Simulator User s manual 1 INSTALLATION Contents of SunShine optical simulator Installation pack Installation CD ROM USB hardware security key User s manual Before installation minimum system requirements should be checked 1 1 System requirements for SunShine v1 2 8 Oo 00000000 Microsoft Windows XP Windows 7 or Vista 2000 Decimal separator Regional Settings should be not Intel Pentium processor gt 1 4 GHz re
9. above see section on the basic ADF settings As mentioned one or more interfaces can be specified in the group by giving their index serial number The index number is starting from zero for front surface 27 SunShine v1 2 8 Optical Simulator User s manual incident_medium Ist_ layer interface and ending at number of all layers for back surface last_layer outgoing medium interface By specifying more than one interface in the box the corresponding index numbers should be separated by commas In case that the interface index exceeds the number of layers interfaces in the structure it is not considered in the simulation Useful hint if you want to apply different ADF settings to each interface in the structure it can be done in the following way in the basic ADF settings set the ADFs which will be applied to the 0 interface In the advanced settings create as many ADF interface groups as the total number of the interfaces is starting with the 1 In each interface group define only one interface the most convenient is that the number of the ADF interface group corresponds to the number of the interface Please note that the defined ADFs are still common for illuminations from both sides of the interface 2 5 TOTAL REFLECTANCE AND TRANSMITTANCE Total specular diffused reflectance and specular diffused transmittance at interfaces can be corrected in this console Basic Settings Include following calibrat
10. created They should have the same structure as the section described The scattering angles fi_scat and incident angles fi_inc have to be the same in al sections The ADF data given in ars files does not need to be normalised sum of ADF values over all discrete angles is not necessary to be one since the normalisation is performed in the simulator internally Note The ADF data in ars files should already include ADF transformations e g 3D 1D transformation transformation for conical illumination For these data the transformations are not performed inside the simulator spk files Illumination spectrum power densities as a function of discrete wavelength is defined in spk file The structure and requirements of the files are explained on example of ADF2R_unity ars file The first part of the file is given in the following 45 SunShine v1 2 8 Optical Simulator User s manual AM1 5 No of used components in the spectrum 81 Wavelength Power density lambda I nm mW cm2 300 0 0 001 310 0 0 102 320 0 Oi 257 330 0 0 391 340 0 0 430 350 0 0 478 The header text before the line No of used components can be changed by user but should not contain any colon sign In the header line No of used components in the spectrum number of spectrum components that will be used for the simulation has to be defined after colon sign The first used component is always the first component defined in the spe
11. factors can be set for corresponding newly specified interfaces If two or three c12 c21 are defined for the same interface their multiplication is used if they appear as multiplying factors In case there are more then one c12 c21 defined as the value of total reflectance of an interface selected option Use specified values c12 and c21 as total reflectance directly the most right value column is taken into account the rest c12 c21 specified as values of total reflectance are ignored but only if they are specified as the values of total reflectance in case they present the multiplication factors they are still taken into account Include following calibration functions to decrease total reflectance at specified interfaces Besides constant c12 and c21 reflectance calibration factors mentioned above external wavelength dependent functions cl2 wavelength and c21 wavelength can be used to correct or set the total reflectance at specified interfaces two sets Specific functions should be defined in separate files brc in lt workdir gt CT_CR folder see description of bre files in section 3 1 with description of input files The names of the existing files without extension can be selected by clicking the down arrow on the right side of the text box or can be entered directly by typing The list of existing brc files is stored in lt workdir gt List ReflCal dat and can be managed by user This kind of calibration with t
12. further is selected In this case the difference between first and the second specified layer is taken as a Jsc lt photo gt valze for optimisation Optimisation criteria The following three options are possible to be chosen e Find minimal Jsc lt photo gt of the selected layer s e Find maximal Jsc lt photo gt of the selected layer s e Find minimal difference in Jsc lt photo gt between two specified layers The first option can be used for minimisation of the optical losses Jsc gt photo gt losses in the selected non active layer s The second option is used to gain Jsc lt photo gt in the selected active layer s in this way the short circuit current of the cell can be improved The third option is used to find the optimal parameters for the minimal difference in the Jsc lt photo gt of two layers first two specified can be utilised to perform the current matching in a tandem cells OPTIMISATION PARAMETERS Four optimisation parameters can be selected each one separately or up to 4 simultaneously more dimensional optimisation e THICKNESS of the selected layer e ROUGHNESS of the selected interface s e REFRACTIVE INDEX of the selected layer e EXTINCTION COEFFICIENT of the selected layer THICKNESS of the selected layer The optimal thickness of the selected layer is searched only one layer at once according to the optimisation criteria selected To enable this option check the corresponding checkbox Furthe
13. has to be as follows 1 lambda wavelength in nano or micro meters depending on selection of nm or um in the heading row previous versions of SunShine allows only micrometers 2 n 3 k 4 alpha absorption coefficient in 1 cm All four columns are necessary to be in the file The decimal separator for the numbers should be dot The numbers may include more than two decimal places The separators between columns can be either spaces or tabulators The file ends with the last numbers of the columns Note Simulations can be carried out only for the discrete wavelengths that are represented in the nk files 40 SunShine v1 2 8 Optical Simulator User s manual cal files Haze calibration functions cT and cR as a function of discrete wavelength and rms roughness sr as a parameter are given in cal files separate files for cR and cT The structure and requirements of the files are explained on the following example of cT_05 cal file only the first part of the file is given The structure of the cR file looks the same cT_05 No of roughnesses sr 1 lambda nm sr nm 50 300 0 0 50 305 0 O 50 310 0 0 50 315 20 0 50 320 0 0 50 325 0 0 50 330 0 0 50 32970 0 50 340 0 0 50 345 0 0 50 350 0 0 50 The header text before the row No of roughnesses can be changed but should not contain any colon The number of cT cR columns has to be specified in the line No of roughnesses sr
14. if Ellipsis 3D ADF is selected Equal in all directions half circular Equal in all directions half circular 3D ADF 1 for all scattering angles in this case The ADF functions with and without 1D 3D transformation are plotted in Cartesian and Polar plot in the following two figures 290 SunShine v1 2 8 Optical Simulator User s manual ETSE BE x ADF p Ww Q N x 0 8 4 7 e 8 5 S 064 A S 2 amp 0 44 2 X ADFip 3p Es 5 5 cal n 7 V1 0 0 y 90 60 30 0 30 60 90 Scattering angle degree Linear Linear 3D ADF is represented by linear function of scattering angle The ADF with and without 1D 3D transformation are plotted in Cartesian and Polar plot in the following two figures Angular distribution function ADF Scattering angle degree Linear ADF results in triangular shape in Cartesian plot Use externally defined ADF1 Externally defined ADFIRs and ADFITs are determined in external files located in lt WORKDIR gt ADF external and can be created by the user Oars SunShine v1 2 8 Optical Simulator User s manual The ADFIRs and ADFITs are represented by the name of the file where corresponding ADFI1R and ADFIT values are specified lt workdir gt ADF_external ADF1_name ars file The name of the ADFIR and ADFIT that appears in the box does not include the file extension ars Rest
15. illumination spectrum The example of the first part of an jph file is given in the following Total intensity Itot Ispec Idif mi cm2 Illumination spectrum AM1 5 1lOnm step 300nm 900m NOTE that for active layers PV active 1 Itot values are given also for internal middle pointes x rnm Itot 1 300nm Itot 1 310n0 Itot 1 320nm Itot 1 330nt0 Itot 1 340n0m 0 000000e 00 1 619950e 03 9 097296e 02 2 4355085e 01 3 079073e O1 4 011505e 0 500000e 06 5 539010e 04 4 866054e 02 560745e O01 2 754229e 01 3 3073 77 e 0 1 501000e 06 1 04953 5e 06 1 955055e 03 2 009140e 02 5 158452e 02 1 569134e 01 501000e 06 9 992463e 07 1 287678e 03 908305e 02 754657e O2 1 493742e 0 501001e 06 9 500880e 07 1 2244786e 03 914004e 02 7 3002 708 02 1 42 4116e 0 501002e 06 9 04708Ge 07 1 165790e 03 727500e 02 7 030707e 0z 1 359071e 0 1 501002e 06 8 617951e 07 1 110203e 03 1 645225e 02 6 702599e 02 1 297987e 01 50100 2e 06 6 2110685e 07 1 057662e 03 5077 45e 02 6 393434e 02 1 240399e 0 1 501003e 06 7 824597e 07 1 007880e 03 1 494464e 02 6 101256e 02 1 185944e 01 1 501004e 06 7 456880e 07 9 6006213e 04 1 42 5009e 02 5 024403 e 02 1 13432 e O1 501004e 06 7 106561e 07 9 15685 e 04 359059e 02 5 561796e 02 1 085304e 0 1 501004e 06 6 772420e 07 8 728997e 04 1 296339e 02 5 312066e 02 1 038667e 01 501005e 06 6 453361e 07 6 321004e 04 236608e 02 5 0743 06e 02 9 942532e 02 1 501006e 06 6 1403 776 07 7 931723e 04 1 179648e 02 4 847641e
16. in each layer last column Ttot total transmittance of entire structure The names of the columns with total absorptances consist of Atot layer index No layer name The decimal separator is dot The separator between columns is tabulator Spec rta file The file contains simulation results on specular reflectance from entire structure Rspec specular absorptances Aspec in individual layers and specular transmittance Tspec of the structure as a function of wavelength 1 The structure of the file is equal as in case of rta files please refer to description of rta files Dif rta file The file contains simulation results on diffused reflectance from entire structure Rdif diffused absorptances Adif in individual layers and diffused transmittance Tdif of the structure as a function of wavelength 1 The structure of the file is equal as in case of rta files please refer to description of rta files GI file The file contains simulation results on photogenerated charge carriers Gl as a function of vertical position in the structure x The parameter is light wavelength 1 48 SunShine v1 2 8 Optical Simulator User s manual The Gl values are calculated and given only for the layers which were selected as PV active in the Structure console The example of the first part of an GI file is given below Generation rate profile Glix f em 3s 1 Illumination spectrum amp
17. lt workdir gt List cT dat respectively are shown You can select one of these calibration function or write the name of another calibration function directly in the box In this case be sure that there exists the_name cal file with corresponding calibration functions in lt workdir gt cT_cR folder Use haze input data HR HT By selecting this option you can define the haze parameters of rough interfaces for reflected light HR left box below and transmitted light HT right box below separately S192 SunShine v1 2 8 Optical Simulator User s manual The haze data HR or HT are represented by the name of the file where corresponding HR or HT values are specified lt workdir gt HT_HR HT_name tis file The name of the haze data that appears in the box does not include the file extension tis The HR and HT values that are given in tis files correspond to the interface between two specific layers that are determined on the top of the tis file In order to apply these haze data to internal interfaces in the structure corresponding cR and cT functions are determined in the model internally Restrictions for the name of a calibration function The name can include letters numbers and character e g HT 01 TCO air HR_01_air_ Ag It should not contain spaces or strange characters e g etc The maximum number of characters in the name is limited to 50 Selecting haze input data By clicking the down arrow
18. method 65 SunShine v1 2 8 Optical Simulator User s manual APPENDIX 2 1 FTDI drivers Installation guide for Windows XP 2 FTDI drivers Installation guide for Windows Vista 3 FTDI drivers Installation guide for Windows 7 source http www ftdichip com 266 x
19. optimisation parameter In the first step N 1 vertices of simplex are calculated the value of the first vertex is calculated in the middle point of the constrained domain red star the second one is calculated closely to the right boundary of the constrained domain black point The method moves the vertex with the worst value in our case of minimization the vertex with highest output value downhill to the minimum by so called extension contraction or reflection of the highest point In the first step the vertex with black point is contracted around the lowest point The point 2 is better than the black point 1 so the black point vertex of the simplex is now moved to the point 2 In the next step the red star vertex of the simplex has worse value therefore the next red star vertex is now beeing searched by the contraction reflection or extension leading towards better solution These steps are repeated until the sufficient accuracy closeness of the solutions is achieved output 4 ___ constrained domain start start 1 1 fe 2 v NRB Xe 4 end global extreme solution optimised variable s Figure A1 Illustration of finding a solution with simplex method The method has much better convergence rate than the method of constant steps Increasing the number of steps always means a better accuracy Pros The method is very fast especially for multi dimensional problems when we have to optimise mor
20. parameters slides e J Kr Analysis and modelling of thin film optoelectronic structures based on amorphous silicon PhD Thesis University of Ljubljana ISBN 961 6371 50 9 Following the license agreement Licensee agreed to cite a reference to one of the following publications KRC Janez SMOLE Franc TOPIC Marko One dimensional semi coherent optical model for thin film solar cells with rough interfaces Informacije MIDEM Vol 32 2002 pp 6 13 or KRC Janez SMOLE Franc TOPIC Marko Analysis of light scattering in amorphous Si H solar cells by a one dimensional semi coherent optical model Progress in photovoltaics Vol 11 2003 pp 15 26 when publishing papers dealing with optical matters worked out with our simulator SunShine at conferences in journal papers or in other type of contributions We cordially wish you a successful use and exploitaition of SunShine simulator Janez Kr Contents 1 INSTALLATION asiseesascecniecs conve teins enna teen 1 1 1 System Requirements for SunShine v1 2 8 00 0000 1 1 2 Installation of SunShine v1 2 8 optical simulator i 1 3 Installation of USB hardware security key 2 1 4 Running SunShine v1 2 8 optical simulator ce 3 1 5 Unlnstallation SunShine v1 2 8 optical simulator 3 2 DESCRIPTION OF USER S INTERFACE 4 2 1 Top Command Line File Tools Help eee 4 22 SEDUOULIEC tat ewes rendu E e E E ts 14 Ded Haze
21. roughness optimisation in this file only the roughness values for the first selected interface is printed out the optimal roughness values for all selected interfaces are plotted in the optimo out file 3 last column Jsc lt photo gt values of the selected layer s for the Jsc lt photo gt optimisation if one layer was selected then this are the Jsc lt photo gt values of this layer if more layers were selected and the criteria of minimal or maximal Jsc lt photo gt was chosen these values represents the sum of the Jsc lt photo gt of the selected layers if two layers were selected and the criteria of minimal difference in Jsc lt photo gt was chosen then these values represents the difference in Jsc lt photo gt between the first and the second selected layer The file is updated after each SunShine iteration optimo out file result of the Optimisation tool This is the final output file of the optimisation process including the list of the optimal values of the input parameters that were chosen for the optimisation Indications on which input parameters were varied optimised and which criteria and Jsc lt photo gt values were used The file is created after the optimisation is finished lif file result of the Calculate LPIF tool Light Path Improvement Factors LPIF as a function of the wavelength are listed For the details of calculation refer to the description of the Calculate LPIF tool Shas SunShine v1 2 8 Optic
22. simulation structure and all the corresponding settings of the input parameters are imported into simulator using this command The input file has to be in a standard format which is created by the simulator using command Save input file or Save input file as Save input file You can save the simulation structure and all the corresponding settings including paths to the data folders used in a standard format of simulator input file In this way the structure and all the settings can be imported in the simulator again by using command Open input file Save input file as You can save the simulation structure and all the corresponding settings in an input file with a new name Print Two options are available e Print input file input file with the simulation structure and all the corresponding settings are printed in text format e Print results The graph created in the Results console including the main description of the structure and comments are printed out You can also create a pdf file with the results if there is Acrobat Distiller installed on your computer pdf printer Exit Exit the simulator program Tools Following option can be found in this menu e cR cT transform e Optimisation tool e Calculate LPIF cR_cT transform The interface of the transform is given below SunShine v1 2 8 Optical Simulator User s manual cR_cT transform The transform generates standard cR or cT input file from meas
23. 0 001 mA cm or if the number of iterations exceeds 2000 RUN OPTIMISATION button Run Terminate the optimisation process Current Iteration number Indicates how many times the SunShine simulator has been run finished with calculation so far in this optimisation process Maximal number of iterations is 2000 RESULTS Basic results optimised input parameters are displayed Complete optimisation results you can find in the optimo_iter out and optimo out files see description of the files in the section devoted to the Output files 10 SunShine v1 2 8 Optical Simulator User s manual NOTES For structures with many layers and rough interfaces the SunShine simulator may need several minutes up to 10 min to calculate the results In the optimisation process of such structures it has to be considered that the executing time of the optimisation may be therefore relative long No Iter x Time_of_one_SunShine_run Running the optimisation tool the SunShine hardware security key has to be inserted into the USB port to enable the iterative execution of the SunShine no special message in the optimisation tool is displayed if the key is not inserted During optimisation process the SunShine simulator should not be started manually For any error occurred during optimisation SunShine error please refer to the SSMessage dat file Calculate LPIF The interface of the transform is shown below K Calculate LPIF The tra
24. 0e 00 0 000000e 00 0 000000e 00 0 000000e 00 0 000000e 00 58 00 0 000000e 00 0 000000e 00 0 000000e 00 4 373545e 06 5 302991e 06 56 00 0 000000e 00 0 000000e 00 0 000000e 00 o 000000e 00 o 000000e 00 54 00 2 641146e 06 3 615005e 06 4 408370e 06 4 433072e 06 5 366061e 06 52 00 0 000000e 00 0 000000e 00 0 000000e 00 o 000000e 00 o 000000e 00 50 00 2 569275e 06 3 646925e 06 4 445299e 06 o 000000e 00 o 000000e 00 48 00 0 000000e 00 0 000000e 00 0 000000e 00 0 000000e 00 0 000000e 00 The power densities in this file are directly comparable with the power densities measured with an Angular Resolved Scattering ARS setup in an incident plane with the lenght of rotating arm of 50 cm for description of ARS measurements refer to documentation on Scattering parameters T adf file In this file the power densities of the diffused transmitted light through entire structure as a function of outgoing angle are given in mW cm The power densities are calculated at the angles from 90 to 90 0 normal direction in the outgoing plane perpendicular to the interfaces of the structure at the distance radius of 50 cm from the structure To re calculate these power densities to other radius R the multiplication factor MF 50 cm R cm should be applied to the values The number of equidistant angles is defined by the parameter Number of equivalent angles per 90 degrees in the Angular Distribution function console The wavelength
25. 20 3 835715e 20 4 706554e420 In the header basic information about the illumination spectrum are given In the row above the columns the wavelength parameter 1 is defined for each of the Gl column The columns are organised in the following way 1 x position of the discrete point in the structure in nanometers It starts with the first point of the first PV active layer 3 and rest columns Gl photogenerated charge carrier values for a specific point and wavelength in 1 cm s The Gl values that are given in the calculation points correspond to the spaces Gl segm defined in the following figure oe one noes Dee calculation points NOTE For accurate representation of Gl sufficient number of calculation points No of Segm has to be defined for the PV active layers in the Structure console 49 SunShine v1 2 8 Optical Simulator User s manual ASA gen file In this file the generation rate data are arranged in the format that can be directly read by Advanced Numerical Simulator ASA 6 simulator developed at Delft University of Technology which can be used as an option for further electrical analysis of the optoelectronic structures jph file The file contains simulation results of total light intensity I specular diffused sum of all forward and backward going components as a function of vertical position x in the structure The parameter is discrete light wavelength lambda taken from the
26. By pressing the button Ctrl all paths in advanced settings and the path of output file in addition are assigned to the current working folder lt WORKDIR gt ATTENTION By importing an input file File gt Import Input File also the paths to the folders and files are imported Check if the folder paths are set properly according to your computer especially by importing an input file created on other computer 2 8 ADDITIONAL SETTINGS COMMENTS Calculation settings Precision level of the calculation can be set This level is related only to the stop condition in tracing of the scattered light beams The default setting is Normal Normal in tandem structures gt 6 layers the precision of the sum Ayes R T 1 absorptances reflectance transmittance can vary up to 3 in this case High the sum Alayers R T 1 varies les than 1 In the case of many layer structures like triple cell High level of precision can increase the calculation time Additional comments and settings if supported by the simulator version can be written in the text box The text will be stored at the end of corresponding input file as additional text 2 9 PROCESS WINDOW In this console messages related to the running or previously running in case of finished action simulation are shown The executed calculations for the wavelengths used in the simulation are indicated on line during simulations Warning and error messages are display
27. DF1 section Ellipsis dependent on incident angle Ellipsis dependent on incident angle 3D An example of Ellipsis ADF which includes dependency of incident angle is shown in Polar plot in the following figure yu outgoing specular beam 180 270 25 SunShine v1 2 8 Optical Simulator User s manual The ellipsis is rotated according to the angle of outgoing specular beam which is related to the incident angle by Snell s law In the figure the 1D 3D transformation and the transformation due to spherical symmetry cone illumination is not included Equal in all directions half circular Equal in all directions half circular 3D The same as in case of ADF 1 refer to description of this option in ADF1 section Linear Linear 3D The same as in case of ADF 1 refer to description of this option in ADF1 section Linear dependent on incident angle Linear dependent on incident angle 3D In case of dependency on incident angle the peak of triangle corresponding to the Linear ADF is shifted according to the angle of outgoing specular beam The angle of outgoing specular beam is related to the incident angle by Snell s law In the following figure an example of Linear ADF2 for non perpendicular incident angle is shown in Cartesian plot The 1D 3D transformation is not included However the approximation used in the simulator to include spherical symmetry cone illumination instead of one beam illumina
28. M1 5 nrel ionm 5 350 900 Total power density of the spectrum 59 62 mW cmz fe inm G1 1 350nm G1 1 3 60mm G1 1 370nm G1 1 380nm G1 1 390nm o 000000e 00 6 444230e 20 7 509213e 20 5 540656e 20 7 981002e 20 9 090066e 20 5 000000e 01 5 975040e 20 7 017852e 20 5 0402765e 20 7 563500e 20 5 667753e 20 1 000000e 00 5 469449e 20 6 475665e 20 7 452103e 20 7 090319e 20 amp 181820e 20 1 500000e 00 5 056650e 20 6 033059e 20 7 014399e 20 6 665761e 20 7 764246e420 2 000000e 00 4 704933e 20 5 650049e 20 6 609317e 20 6 338178e 20 7 396604e 20 2 500000e 00 4 397246e420 5 912 783e 20 6 250420e 20 6 025712e 20 7 066986e 20 3 000000e 00 4 123502e 20 5 010910e 20 5 927454e 20 5 743133e 20 6 767456e 20 3 500000e 00 3 677172e 20 4 737677e 20 5 633631e 20 5 484882e 20 6 492540e 20 4 000000e 00 3 659 707e 20 4 499375e 20 5 364202e 20 5 247033e 20 6 238323e 20 4 500000e 00 3 449746e420 4 25953 6e 20 5 115677e 20 5 026700e 20 6 001910e 20 5 000000e 00 3 262711e 20 4 048503e 20 4 685366e 20 4 621675e 20 5 781092e 20 5 500000e 00 3 090559e 20 3 653174e 20 4 671227e 20 4 630234e 20 5 574133e 20 6 000000e 00 2 931641e 20 3 671849e 20 4 471494e 20 4 450971e 20 5 379643e 20 6 500000e 00 2 754611e 20 3 503133e 20 4 284795e420 4 282 749e 20 196489e4 20 7 000000e 00 2 648356e 20 3 3945874e 20 4 109977e420 4 124626e 20 5 023 740e 20 7 500000e 00 2 521961e 20 3 199116e 20 3 946083e 20 3 975824e 20 4 960633e 20 amp 000000e 00 2 404691e4 20 3 062083e 20 3 792336e4
29. University of Ljubljana Faculty of Electrical Engineering Laboratory of Photovoltaics and Optoelectronics SunShine Optical simulator User s manual Version 1 2 8 including Optimisation tool LPIF transform and 15 ADF groups Ljubljana July 2011 NNNNN NNN NS SunShine gt NNN NNN NNN NS User s manual Copyright 2011 University of Ljubljana Faculty of Electrical Engineering Laboratory of Photovoltaics and Optoelectronics All rights reserved Ljubljana July 2011 Preface SunShine optical simulator is a 1 dimensional simulator that was developed for simulation of thin film multilayer optoelectronic structures such as solar cells and photodetectors Its main advantage is related to simple description and consideration of a complex light scattering process at nano rough interfaces that are introduced in the structure Based on performed verifications on several solar cell structures a Si H pc Si H micromorph hybrid CIGS HIT and others the simulator has been found to be a useful tool investigation and analysis of thin film optoelectronic devices The purpose of this User s manual is to help the user which has already been acquainted with the physical background of the optical model used to carry out the simulations The selection and determination of all input parameters is described For physical background the reader should refer to following references e Presentation on Optical model and input
30. a Select axis box appears on your screen X and Y axis of the new plot can be determined from the data in the table in two ways e by clicking the down arrow at the right side of the text box for determination of X or Y axis and selecting the name of the column from the table e by clicking inside the text box for determination of X or Y axis and then clicking on the desired column directly in the table After selecting X and Y data the added plot should appear in the graph press the Graph button to switch to the graph window In Graph Legend section there should appear the corresponding name with the prefix ext You can change the plot colour in the Graph Legend window refer to the description of Graph Legend NOTE If the existing minimal and maximal values of the graph axes are out of the range regarding to the values to be plotted the plot will not be shown Adjust the minimal and maximal values of the axes appropriately To exclude the external plot from the graph click in the corresponding check box To remove the external plot completely from the graph click the name of the plot with right button of the mouse and select Remove line from graph Comments button Comments to the results can be written in the corresponding box The comments are plotted together with the results if using File gt Print results option They are not stored with the input file 38 SunShine v1 2 8 Optical Simulator User s manual Additiona
31. al Simulator User s manual 4 SIMULATION EXAMPLE A standard pin amorphous silicon a Si H solar cell deposited on textured glass TCO substrate is given as an example of simulation A standard selection of input parameters for the structure is used By means of described procedures for entering and choosing input parameters in specific consoles Structure Haze parameters Angular Distribution Functions Total Reflectance and Transmittance Illumination Spectrum Files Additional Comments Settings Process Window and Results one can create the example structure by his own using the input parameters of the structure given by the following pictures of each console NOTE When running the example file from the existing input file SinShine In Example v1_2_8 dat first in the Console FILE all the paths have to be checked properly assigned to the working directory on your computer See point 6 in the following figures All paths can be assigned by pressing Ctrl and clicking on the Assign paths to lt WORKDIR gt button 1 Structure SunShine v1 2 Example dat Fie Tools Help Structure Roughness Layer nk Thickness nm No of seg rms nm air E 1500000 1000 10 500 20 300 glass TCO_Sn02_Asahi p_a_SiCH asi n_a_SiH tag air A EA ES ET EJA EA EN E r r r Vv Vv Vv x r anced Setting LAYER INCOHERENCY CONDITIONS up to 3 icoherent layers considered Lower
32. all directions half circular Equal in all directions half circular 3D Linear Linear 3D In case that any other specific ADF1 is activated check the list of available internal ADF 1s by clicking the down arrow at the right side of the ADF selection box please contact authors janez krc fe uni lj si for additional information All options except the first appear with and without 3D indexation The 3D indexation means that the ADF transformation from 3 dimensions to 1 dimension 1D 3D transformation is performed on the original ADF This transformation enables that information on scattering in 230 SunShine v1 2 8 Optical Simulator User s manual 3D is considered in 1D model The transformation is simply represented by given multiplication factor in the following equation A ADF p ADF cos 9 cos y SD i where is scattering angle and ADF is angular distribution that refers to the ARS measurements performed in a plane Detailed explanation of this transformation exceeds the scope of this manual For further information on this topic refer to the documentation on Scattering parameters In the following subsections the nine ADF1 options are described and represented in Cartesian and Polar plot as a function of scattering angle in the range from 90 to 90 degrees They refer to both ADF1R and ADFIT Specular direction incoherent In this case all the diffused light beams are propagating in specu
33. as R 21 new c21 scat R 21 The situation is illustrated in the following figure front J back scattered diffused side side beam increased reflectance The c21 scat factor is limited to c21 scat 2 1 In case that R21 becomes gt 1 due to multiplication with c21_ scat it is set to 1 in the simulator automatically By means of c21_ scat factor the effects of enhanced light trapping in the structure can be analysed in a simplified way The interfaces which c21_scatt factor is applied to can be specified in the corresponding box in the same way as described for the basic settings 30 SunShine v1 2 8 Optical Simulator User s manual 2 6 ILLUMINATION SPECTRUM The incident illumination is defined in this console Basic Setting Illumination spectrum In the text box you can specify the illumination spectrum light which is applied to the structure from the incident medium The spectrum is represented by the name of the file where corresponding light intensities as a function of discrete wavelength of the spectrum are specified lt workdir gt Spectrum Spectrum_name spk file The name of the spectrum that appears in the box does not include the file extension spk Restrictions for the name of a spectrum The name can include letters numbers and _ character e g cT_05 cR_1 It should not contain spaces or strange characters e g etc The maximum number of characters in the name is limited to 50
34. can be uninstalled from Control Panel 1 Open Add or Remove programs wizard as described above 2 Select FTDI FTD2XX USB Drivers and click the Remove button SunShine v1 2 8 Optical Simulator User s manual 2 DESCRIPTION OF USER S INTERFACE The user s interface of the SunShine optical simulator consists of several consoles which can be selected by means of menu column on the left side of the main window On the top of the interface a command line is located In the following sections all these items will be described in details command line poe Example dat Roughness Layer nk Thickness nm No of segm rms nm az 82 No of layers air glass 1500000 TCO_Sn02_Asahi 1000 _a_SiCH 10 is SH nS Ag air Structure menu column r r r v Vv v r r 2 1 TOP COMMAND LINE In the top command line you can find following menus e File e Tools e Help File SunShine v1 2 Example dat The file menu contains o e New Open input file Ctrl 0 e Open input file meene hs _ e Save input file acer _ e Save input file as _ Print results e Print e Exit 5 n_aSiH J 6 Ag E air SunShine v1 2 8 Optical Simulator User s manual New This option is used when creating completely new input file new structure and new input parameters Open input file Previously created input files that include information about the
35. ce specular diffused of the entire structure T e Total Absorptance specular diffused in each layer A e Short circuit current density lt photo gt Jsc lt photo gt for particular layer In this case a simplified electrical analysis is taken into account to get output characteristics of the solar cell directly from optical simulations Simplifications concern ideal extraction of all photogenerated charge carriers from the active layers In this case external quantum efficiency QE in some cases denoted with lt photo gt of the PV structure e g a Si H pin solar cell is found to be equal to the absorptance in intrinsic i layer in case of pin solar cell see following equation QE phoio gt A Ant 4 From QE lt photo gt Jsc lt photo gt is calculated as 35 SunShine v1 2 8 Optical Simulator User s manual q J oec hans Dee f Tine A i QE photos 4 f A h 6 625 10 Js q 1 6 10 As Inc is illumination spectrum A discrete wavelength represented in the spectrum the sum refers to the sum of all discrete wavelength components in the spectrum In PV active layers Jsc lt photo gt presents a contribution to the common Jsc lt photo gt of the structure In case of non active PV layer the Jsc lt photo gt values present optical losses expresses in terms of Jsc lt photo gt how much of Jsc lt photo gt is lost in the layer according to potential Jsc lt photo gt that could be obtained from th
36. commended 32 MB of available RAM 48 MB or more recommended Video card with at least 1024x768 pixel resolution and 8 bit 256 colours CD ROM drive USB port 5 MB of available hard disk space for installation Adobe Reader 5 0 or higher installed Two types of installations have to be carried out in the order specified 1 Installation of SunShine v1 2 8 optical simulator 2 Installation of USB hardware security key 1 2 Installation of SunShine v1 2 8 optical simulator Note Do not insert the USB hardware security key before installing this software 1 0S Log on your computer as an administrator or user with administrative rights See your operating system Help for how to log as an administrator It is recommended to close all programs on the computer Insert Installation CD ROM into the computer s CD ROM drive InstallShield Wizard Figure 1 will appear on the screen and guide you through the installation process Press Next If the installation application does not start automatically On the Start menu click Run and type X setup exe where x is the letter of the CD ROM drive When the installation is complete window in Figure 2 will appear Click Finish SunShine v1 2 8 Optical Simulator User s manual ji SunShine InstallShield Wizard Welcome to the InstallShield Wizard for SunShine The InstallShield R Wizard will install SunShine on your computer To continue click Next WARNING This
37. ctrum The text about this header line can be changed but should not include any colon sign The header should end with the keyword mW cm2 After this word the data in two columns should start 1 lambda wavelength in nano or micro meters depending on selection of nm or um in the heading row previous versions of SunShine allows only micrometers 2 Intensity power density in mW cm corresponding the single wavelength or wavelength interval in case of continuous spectrum The decimal separator for the numbers should be dot The numbers can include more than two decimal places The separators between columns can be either spaces or tabulators The file ends with the last row of the four column Listing files The listing files contain a list of options for specific input parameters that can be selected in the text boxes by clicking the down arrow on the right side of the corresponding box There are following listing files layer dat cT dat cR dat ReflCal dat HT dat HR dat ADF lext dat and ADF2ext dat Their names indicate to which input parameter they refer to 46 SunShine v1 2 8 Optical Simulator User s manual Example of layer dat listing file is given in the following Ag air Al glass i_a_SiH n_a_SiH p_a_SiCH TCO_SnO2_Asahi TCO_ZnO_Al Usually these are the names of the source files without extensions with the corresponding data The listing files can be changed by the u
38. ding complex refractive indexes NV n jk as a function of wavelength are specified lt workdir gt nk Layer_name nk file The name of the layer that appears in the corresponding text box does not include the file extension nk Restrictions for the name of a layer The name can include letters numbers and _ character e g i aSiH TCO1 It should not contain spaces or strange characters e g etc The maximum number of characters in the name is limited to 50 Selecting a layer By clicking the down arrow on the right side of the layer box available layers that are listed in lt workdir gt List layers dat are shown You can select one of these layers or write the name of another layer directly in the box In this case be sure that there exists the layer name nk file with corresponding complex refractive indexes of the layer in lt workdir gt nk folder Adding and Removing layers First and last row of the layer boxes correspond to incident and outgoing media respectively Default incident and outgoing media is air You can add or remove layers using following two options e Adding or removing one or several layers on the bottom back side of the existing structure can be done by clicking ADD or REMOVE button on top right side of the window e Adding or removing a layer inside the structure can be done by clicking right mouse button on the layer index number located on the left side of the layer name and select Add la
39. e given spectrum Selected output files rta Spec rta Dif rta Gl jph jsc _R adf _T adf Other results from selected output files of current simulation can be viewed after simulation is finished For details on the files refer to description of the output files in this manual IMPORT results With this option the output files from previous simulations and other files in the standard format of the SunShine output files see description of output files in Section 3 2 can be imported For presentation of the results on the graph refer to the section Plotting external output files Replace last on line plots with new plots in next simulation By selecting this option the on line plots of last simulation and future simulations will be overwritten with the new plots obtained with next simulation If not selected the on line plots will remain on the graph whereas the new results will be added as new plots This option becomes available after first simulation is finished Plot R T A Layer This section refers to on line simulation only Total Reflectance R of entire structure total Transmittance T of entire structure and total Absorptance for specified layers can be selected check box for plotting on the graph The selection can be made before during or after simulation is finished but before running next simulation By changing the structure the layers in this column are changed automatically Jsc lt photo gt This s
40. e parameters Recommended method Cons Always finds a local extreme which is not necessary a global one 64 SunShine v1 2 8 Optical Simulator User s manual Method of constants steps The method of constant equidistant steps scans the parameter area in the predefined points Figure A2 This method is straight forward or brute force method Method scans the whole area without any prediction of a new direction where the solution might occur In case the method scans over the solution it does not stop Due to equidistant discrete steps the finer mesh does not always mean more accurate solution It is not recommended to use the method of constant steps in multidimensional region when the optimal values of more than one variable are searched for instance roughness and thickness Relative error does not apply to this method The user have to define the number of steps which are applied to all dimensions al lt constrained domain start a2 end 1 v 2 a F 5N T g 79 solution for 6 steps x and for 11 stepes 7 8 global extreme solution optimised variable s Figure A2 Illustration of finding a solution with method of constant steps It is not necessary the finer mesh will give a better solution Pros Method can find a global optimum in presence of many extremes It can be applied in sensitivity analysis parameter variations Cons Time consuming method generally not recommended
41. ection refers to on line simulation only Corresponding values of short circuit current density Jsc lt photo gt are listed They present either contribution to the actual Jsc lt photo gt of the structure or losses expressed in terms of Jsc lt photo gt 36 SunShine v1 2 8 Optical Simulator User s manual Graph legend The selected quantities from on line simulations Plot R T A Layer and imported external files are listed here The colour of corresponding plots lines is shown You can change the colour by clicking on the corresponding coloured box the colour palette will open and the desired colour of the plot can be selected Each specified plot can be included or excluded from the graph by clicking corresponding check box in front of the colour box By clicking the right mouse button on the name of selected plot following options appear e Rename line and select vertical axis e Remove line from graph e Clear graph Rename line and select vertical axis New name can be entered in the box which appears The name can be changed also by double clicking left mouse button on the existing name If the settings Replace last on line plots with new plots in next simulation is de selected and a new simulation is run the on line results from previous simulation will automatically get a pre fix Old in case they have not been renamed by the user The option select vertical axis is active only if secondary axis was added to the g
42. ed in case of minor or major problems After pressing run button the process window console appears automatically on the screen The only exception is if we are located in the Result console If it is suspected that there is a problem with simulation please check the messages in the process window 34 SunShine v1 2 8 Optical Simulator User s manual 2 10 RESULTS Within this console main simulation results can be viewed as values in a table or plotted in a graph The console contains following sections and settings e Show results e Replace last on line plots with new plots in next simulation e Plot R T A Layer e Jsc lt photo gt e Graph legend e Graph settings e Graph button e Table button e Comments button Show results Select results for viewing Following options can be selected by clicking down arrow on the right side of the text box e OnLine Results as selected below e Selected output files rta Spec rta Dif rta Gl jph jsc _R adf _T adf e IMPORT results The default option is OnLine Results as selected below OnLine Results as selected below Some of the main results of current simulation can be viewed on line while the simulation is running or after it is finished Selection of the on line results should be done in the Plot R T A and Graph legend areas The results for selection are e Total Reflectance specular diffused of the entire structure R e Total Transmittan
43. es Folder with layer files nk WORKDIR Ink rowse Folder with calibration files cal WORKDIR IcT_cR rowe Folder with haze files tis eWORKDIR HT_HR rowse Folder with external ADF files ars WORKDIR gt ADF_external rowse Folder with illum spectrum files spk _ YVORKDIR gt Spectrum Browse Folder of listing files dat SWORKDIR List yowse 59 SunShine v1 2 8 Optical Simulator User s manual 7 Additional comments settings SunShine v1 2 Example dat DER File Tools Help Additional Settings Comments Calculation settings Precision level Normal High Additional comments will be saved in the input file This is an example of the input file for a Si H pin solar cell Additional Settings Comments 60 SunShine v1 2 8 Optical Simulator User s manual 8 Process Window after simulation is finished SunShine v1 2 Example dat File Tools Help Process window Executing calculation for wavelength 550 nm Executing calculation for wavelength 560 nm Executing calculation for wavelength 570 nm Executing calculation for wavelength 580 nm Executing calculation for wavelength 590 nm Executing calculation for wavelength 600 nm Executing calculation for wavelength 610 nm Executing calculation for wavelength 620 nm Executing calculation for wavelength 630 nm Executing calculation for wavelength 640 nm Executing calculation fo
44. g button appears if following options are selected in the menu column Structure Haze parameters Angular Distribution Function Total Reflectance and Transmittance Illumination Spectrum and Files It enables to see hide and include or modify the specific advanced settings given in the selected console Run Terminate button This is the button for running terminating the simulation Before running the simulation the user should always check if all input parameters in the consoles Structure Haze parameters Angular Distribution Function Total Reflectance and Transmittance Illumination Spectrum and Files are set properly 2 2 STRUCTURE In this console simulated multilayer thin film structure is defined Basic settings Following parameters can be determined e PV active Layers Thickness No of Segm Roughness rms 14 SunShine v1 2 8 Optical Simulator User s manual PV active By activating the check box corresponding to a specific layer the layer is considered as a photovoltaic active This means that light absorption therein causes generation of electron hole pairs photogenerated charge carriers Gl The phenomenon is typical for semiconductor materials e g p i n a Si layers For the layers with selected PV active check box generated charge carriers profiles is calculated and written in G1 output file Layers A layer in the multilayer structure is represented by the name of the file where correspon
45. gs see Basic Settings of Haze parameters 3182 SunShine v1 2 8 Optical Simulator User s manual At specified interfaces coherent specular light coming from the front top side of the structure is scattered in transmission only By including this setting you can exclude light scattering of reflected light in case of coherent incident light coming to the rough interface from the front top side of the structure Situation is illustrated in the following figure coherent scattered specular light light SI coherent 4 fN specular light The interfaces can be specified in the same way as in the case of the previous advanced setting 2 4 ANGULAR DISTRIBUTION FUNCTIONS Angular distribution functions describe angular directional dependency of scattered light in which directions light is scattered at rough interfaces Angular distribution functions for scattered diffused light at rough interfaces are defined in this console Basic Settings Following basic settings are available e No of equivalent angles per 90 degrees e Settings for ADF1 e Settings for ADF2 No of equivalent angles per 90 degrees Definition of angular discrete grid for ADFs The value determines the number of discrete directions in which diffused beams are propagated in the simulator The directions refer to the angles between 0 degree perpendicular direction to the interfaces and 90 degrees For example setting the number of equivalent angles per
46. he Name of the output file box After lunching the simulator s interface the last setting of the checkbox is used Advanced Settings By clicking the button Show Advanced settings following folders can be selected Folder with layer files nk default lt WORKDIR gt nk Folder with calibration files cal default lt WORKDIR gt cT_cR Folder with haze files tis default lt WORKDIR gt HT_HR Folder with external ADF files ars default lt WORKDIR gt ADF external Folder with Illum spectrum files spk default lt WORKDIR gt Spectrum Folder with listing files dat default lt WORKDIR gt List You can change the folders according to the locations of data on your computer However use of default folders is recommended All folders can be selected by Browse function In case of selecting non default paths lt WORKDIR gt it has to be considered that the paths should not contain more than 6 levels of folders Further advanced settings can be used e Assign paths to lt WORKDIR gt button e Assign ALL paths to lt WORKDIR gt button Assign paths to lt WORKDIR gt button By pressing the button paths of all folders specified in the advanced settings are assigned to the current working folder lt WORKDIR gt Assign ALL paths to lt WORKDIR gt button Bou SunShine v1 2 8 Optical Simulator User s manual This option is available with the same button if Ctrl key is pressed on your keyboard
47. he function can be used to calibrate the reflectance of e g back contact back reflector BR in the solar cells Option Use specified functions c12 and c21 as total reflectance directly can be applied by checking the corresponding checkbox 29 SunShine v1 2 8 Optical Simulator User s manual Include following calibration factor to decrease total reflectance of entire structure and increase the light intensity entering the structure By including this setting total reflectance of entire structure R_entire is decreased on basis of the calibration factor c12_entire as specified by the equation given in the console Thus the intensity of light that enters the structure I enter can be increased as defined by the corresponding equation given in the console The cl2_ entire factor is limited to 0 lt cl2_entire lt 1 with a default value of 1 In case of the default value the total reflectance and the entering intensity of light are not affected This option was found to be useful by simulations of HIT type of solar cells Include following calibration factor to increase total reflectance from the back side for scattered light beams at specified interfaces By including this setting total reflectance for scattered diffused light beams at specified interfaces is decreased by the factor c21_ scat if the beams are approaching to the interface from the back side of the structure Increased total reflectance R21 scat is defined
48. ify interface No Select the interval of thickness variation Select the interval of roughness variation absolute from a nm to b nm Specify a o absolute from a nm to b nm Specify a 0 relative to initial thickness from a nm to b nm relative to initial rougnesses from a nm to b nm C relative to initial thickness from a to b Specify b o relative to initial roughnesses from a to b Specify b Q JV REFRACTIVE INDEX n of selected layer Find the optimal refractive index of layer 0 specify layer No Find the optimal extinction coefficient of layer 0 specify layer No Select the interval of extinction coefficient variation Select the interval of extinction coefficient variation 5 relative to initial refractive index Specify a 0 G relative to initial extinction coeficient Specify a 0 from a to b for all wavelengths from a to b for all wavelengths Specify b 0 Specify b 0 NUMERICAL METHODS Specify the method Simulated annealing with high probability slower method high probability of finding a global extreme Simulated annealing with normal probability Simulated annealing with low probability faster method high probability of finding a local extreme Simplex finds local extreme RECOMMENDED C Constant steps Specify the number of steps J 10 Stop the optimisation if the Adsc lt photo gt of the last two iterati
49. ile Isc lt photo gt values are given in mA cm Sum jsc file The file contains simulation results of short circuit current densities Jsc lt photo gt for each PV active and non PV active layer Corresponding values of Jsc lt photo gt are given also for reflectance and transmittance In case of PV active layers the Jsc lt photo gt values contribute to the actual Jsc lt photo gt of the structure whereas in case of non PV active layers incl reflectance and transmittance these values are assigned to the losses expressed in terms of Jsc lt photo gt For the calculation of Jsc lt photo gt refer to description of Results console Example of Sum jsc file Jsc mA cm2 layer 6 770 Rtot losses 0 140 glass losses 5 204 TCO_SnO2_Asahi losses 2 173 p_a_SiCH active 16 003 i_a_SiH active 0 791 n_a_SiH active 1 217 Ag losses 0 000 Ttot losses 32 284 Jsc Total Sum 18 953 Jsc Active Layers R adf file In this file the power densities of the diffused reflected light from entire structure as a function of outgoing angle are given in mW cm The power densities are calculated at the angles from 90 to 90 0 normal direction in the incident plane perpendicular to the interfaces of the structure at the distance radius of 50 cm from the structure To re calculate these power densities to other radius R the multiplication factor MF 50 cm R cm should be applied to the values The number
50. iles tis files ars files spk files listing files layer dat cT dat cR dat ReflCal dat HT dat HR dat ADF lext dat ADF 72ext dat and txt input file with haze measurements created by user for the cR_cT transform which description is given in the first part of section 2 39 SunShine v1 2 8 Optical Simulator User s manual nk files Complex refractive indexes N n jk n refractive index and k extinction coefficient as a function of discrete wavelength lambda are determined for specific layer Beside n and k values absorption coefficient alpha is given in the file alpha 4 PI k lambda The structure and requirements of the file are explained on the following example of i nk file only the first part of the file is given layerl lambda n k alpha nm 1 cm 300 0 3 748 3 140 1315280 124 3050 34815 32125 1287985 427 310 0 3 883 321110 1260690 729 315 0 3 949 3 085 1231174 960 320 0 4 015 3 060 1201659 190 325 0 4 079 3 000 1160604 286 330 0 4 143 2 940 1119549 382 3 39 00 4 205 22809 1071669 494 340 0 4 267 2 770 1023789 606 345 0 4 324 2 685 978645 712 350 0 4 382 2 600 933502 G ETa In the header the description of layer and data columns is given It can be changed by the user except the word alpha nm or um and the last word 1 cm should remain After the word 1 cm the four numerical columns should appear There are four columns specified The order of the four columns
51. ine simulator is run by the optimisation tool automatically The values of the optimising input parameters for the next iteration are defined by the optimisation tool Basic results optimal parameter s of the optimisation are displayerd in the Results section of the tool and stored in the optimo out file The values of the optimisation parameter s and the corresponding Jsc lt photo gt of all iterations performed are stored in the optimo_iter out file in the selected output folder In the following the interface of the optimisation tool is explained OPTIMISATION OF Jsc lt photo gt Optimise the JSC lt photo gt of selected layers Select the sequence number s corresponding to the layer s of which the Jsc lt photo gt is to be optimised The layer number can be found in the SunShine Structure console in front of the layer name If number 0 is entered into the box optimisation on Jsc lt photo gt optical losses corresponding to the reflected light from the structure R is optimised If N 1 layer is specified the optimisation on the transmitted light if any is carried out SunShine v1 2 8 Optical Simulator User s manual More layers than one can be entered use comma delimiter In this case the Jsc lt photo gt of the selected layers are summed up and their sum is considered as a new Jsc lt photo gt value for optimisation The only exception ocurrs if the third optimisation criteria Find minimal difference see
52. ing the haze for transmitted light at glass TCO air substrate with textured TCO air interface surface the layer in transmission of the interface is air In case of haze measurements of reflected light medium in transmission is typically thin Ag film e Specify the folder of the nk data the folder where the files nk with the complex refractive indexes of layers are stored e Specify the name of the cR or cT file the name of the file where the calculated cR or cT data as a function of wavelength are stored The extension of the file should be cal calibration files for haze parameter e Specify the folder of the cR or cT file the folder where the created cR and cT files are stored Run button The transform is lunched by clicking on this button Optimisation tool The interface of the optimisation tool OPTIMO is shown below OPTIMO optical optimisation tool add on for SunShine OPTIMISATION OF Jsc lt photo gt Find minimal Jsc lt photo gt of the selected layer s Optimisation criteria Find maximal Jsc lt photo gt of the selected layer s specify layer No 0 corresponds to R Find minimal difference in Jsc lt photo gt between two specified layer Optimise the Jsc lt photo gt of selected layer s OPTIMISATION PARAMETERS IV THICKNESS of selected layer V ROUGHNESS of selected interface s i Find the optimal thickness of layer 1 specify layer No Find the optimal roughness of selected interface s spec
53. ion factors to decrease total reflectance at specified interfaces The total reflectance of interfaces rough or flat can be decreased by factor c12 for the light both specular and diffused component approaching the interface from the front top side of the structure For the light approaching the interface from the back side the total reflectance at the interface can be decreased by factor c12 Decreased total reflectances for the light from front side R12 new and for the light from back side R21 new are calculated as R12_new cl2 R12 and R21_ new c21 R21 Factors c12 and c21 are limited to 0 lt c12 lt 1 and 0 lt c21 lt 1 with a default value of 1 In case of the default value total reflectances are not affected They are mainly used to decrease total reflectance of rough interface e g due to index grading effect etc The values of the factors can be determined based on empirical observations or by means of a theory e g Effective Medium Theory if applicable to the roughness morphology outside of the simulator The values specified for c12 and c21 can also be directly used as total reflectances from the front and back side of the interface In this case the option Use specified values c12 and c21 as total reflectance directly should be selected You can specify one or more interfaces in the box to apply c12 and c21 by giving their index number The index number is starting from zero for front surface incident_medium Is
54. ion is not applied for each wavelength separately As a result the optimisation tool returns the FACTOR which defines the optimal n values as n_optimal n_initial FACTOR should be calculated by the user EXTINCTION COEFFICIENT k of selected layer The optimal value of the extinction coefficient of the selected layer is searched in the same way as the refractive index in the previous case As a result the FACTOR defining the optimal k is deterimined thus the optimal k can be calculated as k_optimal k_initial FACTOR NUMERICAL METHODS The method defining the way of changing the selected input optimisation parameters thickness roughness n k according to the values of Jsc lt photo gt from previous iterations Following numerical methods can be selected in the optimisation tool e Simulated annealing with high probability slower method high probability of finding a global extreme e Simulated annealing with normal probability e Simulated annealing with low probability faster method high probability of finding a local extreme e Simplex finds local extreme e Constant steps A detailed description of the methods can be find in Appendix 1 of this manual Stop the optimisation if AJsc lt photo gt of the last two itteration is smaller than L__ Define the criteria for finishing the optimisation process Besides this criteria the optimisation is stopped also if the absolute difference in Jsc lt photo gt is greater or equal
55. is set to SSOut SunShine OUTput file At the bottom of the basic settings there exists a check box Ask if overwrite output files If the check box is activated there appears a warning message if the output file with the same name as specified in the text box already exists in the output folder the box appears after pressing run button By lunching the simulator the status of the check box is equal to the status of last simulation Folder of the output files Folder of the output files can be selected by Browse function or typed directly A new folder can be created by direct typing if the root path to the folder that we want to create is valid already exists wR Dias SunShine v1 2 8 Optical Simulator User s manual The newly created folder should meet all the requirements for the file names in Windows XP Additionally it should not contain more than 50 characters Spaces are allowed to be used in the name of the output folder Working folder lt WORKDIR gt This is the folder where the simulator program is running It was defined during the installation of the simulator The lt WORKDIR gt should not contain more than 6 levels of folders The simulator detects automatically the path of the lt WORKDIR gt Check box Ask if overwrite output files By checking this box the program asks you before running simulation whether you want to overwrite the existing files in case their name is the same as current specification in t
56. l tips Plotting on line results R T A Graph button should be switched on Select the desire quantity to be plotted by activating the corresponding check box in the Plot R T A Layer section If the graph settings axes are set appropriately plots should appear on the graph during or after running the simulation Plotting external output data Select the desire output file in the Select Results option using Browse Press the Table button on bottom left side of the console By pressing the Add line to graph button a Select axis box appears on your screen X and Y axis of the new plot can be determined from the table in two ways e by clicking the down arrow at the right side of the text box for determination of X or Y axis and selecting the name of the column from the table or e by clicking inside the text box for determination of X or Y axis and then clicking on the desired column directly in the table After selecting X and Y data the added plot should appear in the graph press the Graph button to switch to the graph window In Graph Legend section there should appear the corresponding name with the prefix ext You can change the plot colour in the Graph Legend window refer to the description of Graph Legend 3 DESCRIPTION OF FILES Structure of input and output files is described All input and output files can be viewed as normal text files 3 1 Input files There are following input files e nk files cal files bre f
57. lar direction as in case they were not scattered Thus the direction of scattered light beams remains perpendicular only the nature of light is changed from coherent incident specular beam to incoherent Lambertian cos n Lambertian cos n 3D ADF is determined by Lambertian cosine function of scattering angle in this case The factor n in the denotation represents the power of cosine function square qubic and can be specified in the additional box that appear in case of choosing Lambertian ADF 1 The ADF functions with and without the mentioned 1D 3D transformation are plotted in Cartesian and Polar plot for n 1 in the following two figures 180 Angular distribution function ADF SA ADFip3p gt 300 Scattering angle degree 210 Lambertian ADF with power 1 results in a circle in the polar plot Sale SunShine v1 2 8 Optical Simulator User s manual Ellipsis Ellipsis 3D ADF is represented by geometrical ellipsis The ADF functions with and without 1D 3D transformation are plotted in Cartesian and Polar plot in the following figures Angular distribution function ADF Scattering angle degree The radius ratio b a defines the broadness of the ellipsis and thus of the ADF Larger the b a ratio is more light is scattered into larger scattering angles away from specular direction The b a ratio can be specified in the box that appears additionally
58. lator User s manual In the next header line No of scattering angles fi scat the correct number of discrete scattering angles that appear in the file has to be specified after the colon sign In the header line No of incident angles fi inc the correct number of discrete incident angles that appear in the file as different columns has to be specified after the colon sign In case of ADF1 typically only one incident angle is specified at zero degrees In the header line No of rms roughnesses sr the correct number of discrete rms roughnesses that appear in the file as different data sections has to be specified after the colon sign The text above the header row No of scattering angles fi scat can be changed but should mee not include colon sign The data sections referring to different rms rougnesses sr should be organised in following way e First the corresponding rms roughness sr in nanometers should be determined after sign e After the name fi scat deg incident angles should be defined in degrees for each column following the sign fi_inc deg e In the first column the values for incident angles has to be defined in degrees The number of rows should correspond to the specified number of scattering angles e In all other columns the ADF values for corresponding scattering and incident angle are given e For other rms roughnesses sr new data sections has to be
59. line plots with new plots in next simulation Plot Jsc lt photo gt RITA Layer mA cm2 Graph legend Graph settings WR TA M mmm 4c Min Max Step Label Loge F yess ee di Teo Ona 300 1100 50 Wavelenath nm T E Iv TCO_SnO2_Asat 3 34 0 o via Laver T J p_a_SiCH 2 30 I i_a_SiH 16 42 I na_SiH 0 94 Vv Ag 157 Results RITIA Layer 500 550 600 650 700 750 800 850 950 1 000 1 050 Wavelength nm 62 SunShine v1 2 8 Optical Simulator User s manual APPENDIX 1 Optimisation tool of SunShine v1 2 8 simulator Numerical method description The methods in the optimisation tool OPTIMO are based on the following three numerical techniques for finding an extreme minimum or maximum e Simulated annealing e Simplex e Method of constant steps These techniques are generally used in numerical optimisation tools Reference W H Press S A Teukolsky W T Vetterling B P Flannery Numerical Recipes in C The Art of Scientific Computing Cambridge University Press 2 ed 2002 Short description of the techniques Simulated annealing The idea of this technique is to apply a temperature increasing the output value by a weighted random value introduction of a random component to the intermediate solutions and than slowly decreasing its influence the weight is getting smaller so that the random value is loosing the effect on the output value In this way the soluti
60. n incident angle 3D z Use other ADFs for specified interfaces 56 SunShine v1 2 8 Optical Simulator User s manual 4 Total Reflectance and Transmittance SunShine v1 2 Example dat File Tools Help Total Reflectance and Transmittance JT Include following calibration factors to decrease total reflectance at specified interfaces Include following calibration functions to decrease total reflectance at specified interfaces T Include following calibration factor to decrease total reflectance of entire structure and increase the light intensity entering the structure Include following calibration factor to increase total reflectance from the back side for scattered light beams at specified interfaces 57 SunShine v1 2 8 Optical Simulator User s manual 5 Illumination Spectrum SunShine v1 2 Example dat File Tools Help Spectrum llumination Spectrum jem 5_10nm_step_300nm_900nm X Spectrum is represented by Coherent direct light applied perpendicularly to the structure Combination of perpendicular coherent direct light and incoherent diffused light 58 SunShine v1 2 8 Optical Simulator User s manual 6 Files SunShine v1 2 Example dat File Tools Help File locations Name of the output files SSOut_example Folder of the output files YWORKDIR Out Browse Working folder lt WWORKDIR C Program Files SunShine I Ask if overwrite output fil
61. ng the following thickness conditions thicknesses are denoted with d Fully coherent layers d gt dincoh dincoh dincoh init factor dincoh init AF 2 AA n A light wavelength in the air nm Ad spectral width of the monocromatic illumination in meas setup set to 4 nm n refractive index of the layer Fully coherent layers d lt deoh decon dincon C_ factor In coherent layers dcon lt d lt dincon In coherency level is calculated as a linear function of d At an interface I factor and C_factor can be set by the user default values are 1 The thick layers that are to be treated incoherently can be located at any position in the structure If there are more than three thick layers exciding the condition d lt deon only the three optically thickest layers that exceeds the condition are treated incoherently the rest are analysed as fully coherent layers irrespective of their thickness sie SunShine v1 2 8 Optical Simulator User s manual 2 3 HAZE PARAMETERS Haze parameters describe how much of light is scattered at a rough interface in the structure Basic settings Haze parameters can be defined in two ways e Select power factor for calculation of haze parameter for transmitted light HT e Use calibration functions cR and cT e Use haze input data HR HT Select power factor for calculation of haze parameter for transmitted light HT Power factor in the equation of scalar scattering theo
62. nsform calculates the Light Path Improvement Factor LPIF of a selected layer in the improved structure with respect to the reference structure Select the _ratio jph file of the REFERENCE structure Select the _ratio jph file of the IMPROVED structure C Program Files SunShine Out S Out_example_flat_ratio iph C Program Files SunShine Out S Out_example_ratio jph SELECT THE LAYER column SELECT THE LAYER column Newton don RTO HOARSE 0 001754 0 442247 fo 300 0 0 341925 0 001908 0 269710 0 0691 0 025887 0 456562 0 310 0 0 501796 0 027863 0 362479 0 000 0 0613 0 120781 0 473895 00 320 0 0 641470 0 128792 0 370381 0 000000 0 0497C 0 280848 0 497286 000 E 330 0 0 748628 0 296308 0 384630 0 0 0324 0 462503 0 526366 i Wo z 340 0 0 824418 0 474578 0 405024 0 0 0242 0 608408 0 555832 0 000000 350 0 0 878446 0 618311 0 426712 a Specify the name of the LPIF output file w o extension LPIF_out Specify the folder of the LIPF output file C Program Files SunShine Out LPIF_test S 1 079755 1 143531 1 198802 1 244660 1 293116 1 342731 1 414235 1 510903 1 648873 1 815417 1 gt The transform calculates the Light Path Improvement Factor LPIF in a layer in two different optical systems The factor defines how much the optical path of the light crossing the layer is improved in the improved optical system structure according to the reference structure 11
63. of equidistant angles is defined by the parameter Number of equivalent angles per 90 degrees in the Angular Distribution function console The wavelengths are defined by the spectrum used 51 SunShine v1 2 8 Optical Simulator User s manual The example of the R adf file is given below only the first part of the file angle deg JphDifR l 350nm JphbitR 1 360nm JphDifR l 370nm JphDifR 1 380nm IJphDifR 1 390nm 88 00 2 222326e 10 1 964322e 10 1 655520e 10 1 158138e 10 9 550321le 11 86 00 0 000000e 00 0 000000e 00 0 000000e 00 o 000000e 00 o 000000e 00 84 00 o 000000e 00 o 000000e 00 o 000000e 00 o 000000e 00 o 000000e 00 82 00 0 000000e 00 0 000000e 00 0 000000e 00 0 000000e 00 0 000000e 00 80 00 0 000000e 00 0 000000e 00 0 000000e 00 o 000000e 00 o 000000e 00 78 00 o 000000e 00 o 000000e 00 o 000000e 00 o 000000e 00 o 000000e 00 76 00 0 000000e 00 0 000000e 00 0 000000e 00 0 000000e 00 0 000000e 00 74 00 0 000000e 00 0 000000e 00 0 000000e 00 o 000000e 00 o 000000e 00 72 00 o 000000e 00 o 000000e 00 o 000000e 00 o 000000e 00 o 000000e 00 70 00 2 345636e 06 2 9993 14e 06 3 067630e 06 3 696125e 06 4 4600920e 06 68 00 0 000000e 00 0 000000e 00 0 000000e 00 0 000000e 00 o 000000e 00 66 00 0 000000e 00 0 000000e 00 0 000000e 00 0 000000e 00 0 000000e 00 64 00 2 54292 1e 06 3 245074e 06 3 966102e 06 o 000000e 00 o 000000e 00 62 00 o 000000e 00 o 000000e 00 o 000000e 00 o 000000e 00 o 000000e 00 60 00 0 00000
64. on can get trapped inside the deepest hole minimum with the global solution The strategy for finding a maximum is similar In the case that the solution falls in a local minimum the temperature randomisation component is usually high enough to knock it out The probability of finding a global minimum extreme is higher for slower cooling and higher temperatures Simplex techniques described later is the variant of simulated annealing technique with the temperature of 0 In our tool we have built in 3 different preset methods 1 Simulated annealing with high probability slower method high probability of finding a global extreme 2 Simulated annealing with normal probability 3 Simulated annealing with low probability faster method high probability of finding a local extreme Pros Method can find a global extreme Cons It can be a time consuming method ian SunShine v1 2 8 Optical Simulator User s manual Simplex Nealder Mead method Method always finds a local extreme global optimisation is not possible In N dimensional space the method uses a simplex geometrical figure with N 1 vertices 1 The key issue of the method is to move the simplex with N 1 vertices downhill to the minimum or uphill to a maximum In many of our cases simulations we have only one extreme which is also the global extreme in the constrained domain Figure Al presents the simplex method in 1 dimensional space 1D one input
65. on the right side of the text box available haze data HR and HT that are listed in lt workdir gt List HR dat and lt workdir gt List HT dat respectively are shown You can select one of these haze data or write the name of another haze data directly in the box In this case be sure that there exists the name tis file with corresponding haze values in lt workdir gt HT_HR folder Advanced Settings By clicking the button Show Advanced settings following two options are possible to be included e Use other haze parameters for specified interfaces e At specified interfaces coherent specular light coming from the front top side of the structure is scattered in transmission only Use other haze parameters for specified interfaces By including this setting you can apply other Calibration functions or Haze input data to specified interfaces You can specify one or more interfaces in the box by giving their index number The index number is starting from zero for front surface incident_medium Ist layer interface and extension at number of all layers for back surface last_layer outgoing medium interface By specifying more than one interface in the box the corresponding index numbers should be separated by commas In case that interface index exceeds the number of layers in the structure it is not considered in the simulation The selection of Calibration functions and Haze data is performed in the same way than in basic settin
66. ons is smaller than 0 1 Current iteration number 0 OPTIMAL RESULTS Thickness nm Rougness nm Ref index FACTOR Ext coef FACTOR 0 00 0 00 0 000 0 000 See also the corresponding output files in the output folder as defined in the SunShine File console SunShine v1 2 8 Optical Simulator User s manual By means of the transform optimal thickness roughness refractive index and or extinction coefficient of selected layer and interfaces can be searched according to the selected criteria for the photocurrent Jsc lt photo gt of the specified layer s Optimisation on Jsc lt photo gt is important because in the active layers PV active the Jph lt photo gt presents the potential photocurrent which can be gained can be used for maximising the photocurrent of the cell whereas in the non active layers the corresponding Jsc lt photo gt represents the optical losses expressed in the photocurrent units can be used for minimising the optical losses in the cell In the optimisation process the structure which is currently defined in the SunShine consoles considering all the input parameters set is optimised Optimisation process and the input output files involved are schematically shown in the figure below variation of the input parameters SSIn dat Optimisation tool SunShine Jsc lt photo gt Optimal input results of each Sum iso parameters iteration _optimo out optimo_iter out SunSh
67. program is protected by copyright law and international treaties Figure 1 je SunShine InstallShield Wizard xj InstallShield Wizard Completed The InstallShield Wizard has successfully installed SunShine Click Finish to exit the wizard Cancel Figure 2 1 3 Installation of USB hardware security key Insert USB hardware security key into a free USB port Then FTDI drivers have to be installed by the user Please refer to original FTDI drivers installation guides given in Appendix 2 starting on page 66 Depending on the operation system on your computer Win XP Vista or Win 7 different instructions should be followed Please note that drivers from the installation CD should be used SunShine Driver_USB SunShine v1 2 8 Optical Simulator User s manual 1 4 Running SunShine v1 2 8 optical simulator Note In order to be able to run simulations you should have your USB hardware security key inserted into the computer On the Start menu click Programs gt SunShine gt SunShine SunShine interface should appear on the screen 1 5 UnInstallation SunShine v1 2 8 optical simulator The program can be uninstalled using standard uninstallation procedure 1 Open Control Panel by clicking Start menu gt Settings gt Control Panel 2 Double click on Add or Remove programs to open the wizard 3 Select SunShine and click the Remove button USB hardware security key has separate drivers which
68. r on enter the selected layer number in the box below There are three options to determine the interval of the thickness variation within this interval the solution is searched e absolute from a nm to b nm e relative to initial thickness from a to b nm e relative to the initial thickness from a to b Select the option and enter the number for a and b into the corresponding boxes ROUGHNESS of selected interface s The optimal vertical rms roughness es of selected interface s are searched More than one interface can be selected for roughness optimisation in the corresponding box delimiter comma This option is offered because by changing the roughness of the substrate the roughnesses of all deposited layers on the substrate are affected If more interfaces is selected their roughness is changed equally in the optimisation process following the selected rule for changing The optimisation is carried out on the set of interface roughnesses and not for each particular interface separately SunShine v1 2 8 Optical Simulator User s manual REFRACTIVE INDEX of selected layer The optimal value of the refractive index n of the selected layer is searched the interval of the relative change of the refractive index can be defined This interval is considered equally for all n values corresponding all wavelengths used Thus n values in entire wavelength region are changed following the same rule The optimisat
69. r wavelength 650 nm Executing calculation for wavelength 660 nm Executing calculation for wavelength 670 nm Executing calculation for wavelength 680 nm Executing calculation for wavelength 690 nm Executing calculation for wavelength 700 nm Executing calculation for wavelength 710 nm Executing calculation for wavelength 720 nm Executing calculation for wavelength 730 nm Executing calculation for wavelength 740 nm Executing calculation for wavelength 750 nm Executing calculation for wavelength 760 nm Executing calculation for wavelength 770 nm Executing calculation for wavelength 780 nm Executing calculation for wavelength 790 nm Executing calculation for wavelength 800 nm Executing calculation for wavelength 810 nm Executing calculation for wavelength 820 nm Executing calculation for wavelength 830 nm Executing calculation for wavelength 840 nm Executing calculation for wavelength 850 nm Executing calculation for wavelength 860 nm Executing calculation for wavelength 870 nm Executing calculation for wavelength 880 nm Executing calculation for wavelength 890 nm Executing calculation for wavelength 900 nm wewneeenn SunShine gt SIMULATION FINISHED 61 SunShine v1 2 8 Optical Simulator User s manual 9 Results after simulation is finished SunShine v1 2 Example dat File Tools Help Results Show results OnLine results as selected below J Replace last on
70. raph see Add Remove secondary axis option on next page Selection of left default and right secondary axis with different scales is possible Remove line from graph Selected plot is removed from the graph and legend Clear graph All plots are removed from graph and legend Graph Settings For horizontal X and vertical Y axis of the graph following settings can be determined e Min minimal value Max maximal value Step defining the density of tick labels on axis Label name of axes units Log apply logaritmic scale Autoscale autoscale the axis The values are transferred into the graph window after pressing Apply button 3T SunShine v1 2 8 Optical Simulator User s manual Graph button By pressing the button a graph with corresponding plots is activated Add Remove secondary axis These two options can be found by pressing right mouse button on the graph They enable to add and remove additional vertical axis on the graph which appears on the right side of the graph if at least one plot is assigned to the axis see option Select axis in Graph legend description Table button By pressing the button a table with corresponding values of e R T and A results of on line simulation or e data from other output files selected by Select results option can be viewed At the top left corner of the table window the button Add line to graph is located Add line to graph button By pressing the button
71. rictions for the name of external ADFIR and ADF IT The name can include letters numbers and _ character e g ADF1R_TCO1 It should not contain spaces or strange characters e g etc The maximum number of characters in the name is limited to 50 Selecting external ADF1R and ADF IT By clicking the down arrow on the right side of the text box available ADFIR and ADFIT that are listed in lt workdir gt List ADF lext dat are shown You can select one of these ADF1 data or write the name of another external ADF1 directly in the box In this case be sure that there exists the name ars file with corresponding ADFIR or ADFIT values in lt workdir gt ADF_ external folder Settings for ADF2 As in case of ADF1 also here two options are possible to define ADF2 e Use internally defined ADF2 e Use externally defined ADF2 Use internally defined ADF2 Internally defined ADF2s are pre determined inside the model Some of the internal ADF2s have additional parameters that can be set by the user ADF can be defined for reflected ADF2R and transmitted light ADF2T scattered at rough interfaces Selection can be made by clicking the down arrow on the right side of the boxes for specifying ADF2R upper box and ADF2T bottom box In both cases one can choose between following 13 pre defined ADF2s e Specular direction incoherent Lambertian cos n Lambertian cos n 3D Ellipsis Ellipsis 3D Ellipsis dependent on incident angle
72. rt of the file is given BRcor_08_09 No of roughnesses sr 1 lambda nm sr nm 50 300 0 0 80 305 0 0 80 310 0 0 80 SESAO 0 80 320 0 0 80 325 0 0 80 330 0 0 90 335 0 0 90 340 0 0 90 345 0 0 90 350 0 0 90 The header text before the row No of roughnesses can be changed but should not contain any colon The number of c12 columns has to be specified in the line No of roughnesses sr which should end with a colon before the number Each sr roughness has to be specified above nn corresponding c12 column after sign The order of the columns has to be as follows 1 lambda wavelength in nanometers 2 c12 values for corresponding rms roughness sr 3 and rest c12 values for the next rms roughnesses sr The decimal separator for all numbers should be dot The numbers can include more than one decimal places The separators between columns can be either spaces or tabulators The file ends with the last data of the columns Note If certain bre file is included in the simulation all the discrete wavelengths of the selected input spectrum should be represented also in the bre file while for the roughnesses linear interpolation between the specified sr values is used in the simulator 42 SunShine v1 2 8 Optical Simulator User s manual tis files Haze data HT or HR as a function of discrete wavelength and rms roughness sr parameter are given in tis files The struc
73. ructure The ratio jph is one of the output files of the SunShine v1 2 8 simulator As described in the section devoted to the Output files the file consists of the ratio values I d I O for each 12 SunShine v1 2 8 Optical Simulator User s manual simulated wavelength required for the LPIF calculation The ratio jph file of the reference structure should be selected using Browse button Select the _ratio jph file of the improved structure The _ratio jph file of the improved structure should be selected using Browse button SELECT THE LAYER column In the table below the user should select the column that corresponds to the layer in which LPIF will be calculated The column should be selected for the reference as well as for the improved structure typically the same layer should be selected in both cases If no column is selected by the user the first layer is considered for the LPIF calculation Specify the name of the LPIF output file The name of the output file without extension where the LPIF values as a function of the wavelength will be stored should be entered The tool adds the extension lif to the output file automatically It is recommended to give the lif file a name which links the names of the reference and the improved structure for later recognising Specify the folder of the LPIF output file Define the folder in which the lif file will be stored RUN button Execu
74. ry defining the haze parameter for transmitted light HT is defined here for more information on the meaning of this factor please refer to the documentation on Scattering parameters Options 2 3 or user defined can be selected Use calibration functions cR and cT By selecting this option you can specify the calibration function for haze parameter for reflected light cR left text box below and for haze parameter for transmitted light cT right box below separately The calibration functions are needed in the modified equations of scalar scattering theory that are used to calculate haze parameters HR and HT at an internal interfaces for details and physical background refer to documentation on Scattering parameters The calibration functions cR and cT are represented by the name of the file where corresponding cR or cT values are specified lt workdir gt cT_cR CR_name cal file The name of the calibration function that appears in the box does not include the file extension cal Restrictions for the name of a calibration function The name can include letters numbers and _ character e g cT_05 cR_1 It should not contain spaces or strange characters e g etc The maximum number of characters in the name is limited to 50 Selecting a calibration function By clicking the down arrow on the right side of the text box available calibration functions cR and cT that are listed in lt workdir gt List cR dat and
75. s are defined by the spectrum used The example of the T adf file looks similar to the example of R adf file from previous section The power densities in this file are directly comparable with the power densities measured with an Angular Resolved Scattering ARS setup in an outgoing plane hrt file Calculated haze of the reflected light of the entire simulated structure and of the transmitted light through the structure are presented as a function of incident light wavelength First column is light wavelength in nanometers second column is haze for reflected light ARstructure 0 1 whereas the third column is the haze for the transmitted light ARstructure O 1 SSO SunShine v1 2 8 Optical Simulator User s manual ratio jph Ratios of total light intensities at the end of the layers I d over the total intensities at the beginning of the layer 0 are given as a function of light wavelength for each layer in the structure These ratios are used in the calculations of Light Path Improvement Factor LPIF Refer to the description of the Calculate LPIF tool optimo_iter out file result of the Optimisation tool This is the output file where the results of each iteration in the optimisation process are stored The file is organised as follows 1 column Iteration number 2 set of columns the values of the input parameters or corresponding factors which were involved in the optimisation In the case of
76. ser Each new option has to be specified in a new row No empty rows are allowed between the specified options By making new data input file e g new nk file the name should be added in the corresponding listing file by the user 3 2 Output files There are following output files available e rta e Spec rta Dif rta Gl ASA gen jph jse Sum jse R adf T adf hrt ratio jph optimo_iter out result of the Optimisation tool optimo out result of the Optimisation tool lif result of the transform Calculate LPIF rta file The file contains simulation results on total reflectance from entire structure Rtot total absorptances Atot in individual layers and total transmittance Ttot of the structure as a function of wavelength 1 47 SunShine v1 2 8 Optical Simulator User s manual The example of the first part of an rta file is given in the following l nm Rtot Atotl_glass Atot2_TCO_Sn0O2_Asahi Atot3_p_a_SiCH 300 0 0 0471 0 6271 0 3252 4 0400e 4 310 0 0 0502 0 4732 0 4628 8 6310e 3 320 0 0 0539 0 3391 0 90259 0 0503 330 0 0 0586 0 2359 0 4892 0 1316 340 0 0 0653 0 1625 0 3948 0 2229 350 0 0 0713 0 1108 0 3000 0 2960 A simple header one line with the column names is chosen due to simplicity of importing data in other programs The columns are organised as follows 1 1 wavelength in nanometers 2 Rtot total reflectance of entire structure 3 Atot total absorptances
77. t_layer interface and ending at number of all layers for back surface last_layer outgoing medium interface 28 SunShine v1 2 8 Optical Simulator User s manual By specifying more than one interface in the box the corresponding index numbers should be separated by commas In case that interface index exceeds the number of layers in the structure it is not considered in the simulation The option Include following calibration factors to decrease total reflectance at specified interfaces can be extended with additional calibration factors function see Advanced settings in the next paragraph Advanced Settings By clicking the button Show Advanced settings following options are possible to be included e If option Include following calibration factors to decrease total reflectance at specified interfaces was selected there appear two additional columns on the top right to set new c12 and c21 factors at specified interfaces e Include following functions to decrease total reflectance at specified interfaces e Include following calibration factor to decrease total reflectance of entire structure and increase the light intensity entering the structure e Include following calibration factor to increase total reflectance from the back side for scattered light beams at specified interfaces Include following calibration factors to decrease total reflectance at specified interfaces In the two new columns additional c12 and c21
78. te the calculation and create the lif output file Results LPIF values as a function of the wavelength are displayed in the table The displayed values are stored also in the above specoified lif file If NAN are involved in the results the calculation of the LPIF vas not possible with the given d and 1 0 values in most cases the reason is too high absorption in the layer for shorter wavelengths usually Help located in the basic command line of the SunShine simulator Help menu contains e User manual e About User manual A pdf file with this user s manual is opened if Acrobat Reader program is installed on your computer About Basic information about the version of the SunShine optical simulator is given Sia SunShine v1 2 8 Optical Simulator User s manual Menu column The menu column is located on the most left side of the interface window It contains following items SunShine v1 2 Example d STRUCTURE File Tools Help HAZE PARAMETERS ANGULAR DISTRIBUTION FUNCTIONS TOTAL REFLECTANCE AND TRANSMITTANCE ILLUMINATION SPECTRUM FILES ADDITIONAL SETTINGS COMMENTS PROCESS WINDOW RESULTS By selecting specific option corresponding console window is opened discussed in detail in the following sections 2 1 2 8 The outlook of each of the console can be viewed in section 4 where the settings for a simulation example are shown Show Advanced Settings Hide Advanced Settings button The correspondin
79. tensities specified in the spectrum file The ratio diffused diffused direct has to be determined in the range 0 1 Value 0 corresponds to the presence of direct coherent component only equal to selection of the first option whereas the value 1 corresponds to the presence of diffused component only all light of the spectrum is diffuesed For the diffused component of the spectrum angular distribution function ADF has to be defined The selection of ADF is the same as described in Angular Distribution Function console for ADF1 refer to ADF1IR or ADFIT selection 2 7 FILES Output files and paths to all input and output files are specified in this console Basic Settings Following files and folders can be defined e Name of the output files e Folder of the output files e Working folder lt WORKDIR gt Name of the output files In the text box the core first basic part of the names of the output files is defined The first words that appear in all output files are represented by this core Pre defined extensions are added to the output files by the simulator depending on the type of the results see more details on the output files in the description of output files The name of the output files should meet all the requirements for the file names in Windows XP Additionally it should not contain more than 50 characters Spaces are allowed to be used in the name of the output file The default name of the output files
80. thickness limit d_incoh for a fully incoherent layer Upper thickness limit d_coh for a fully coherent layer d_incoh d_incoh_init _factor d_coh d_incoh C_factor factor 1 C_factor 1 d_incoh_init nm lambda nm 2 2 Pl 4nm refr ind 54 SunShine v1 2 8 Optical Simulator User s manual 2 Haze parameters SunShine v1 2 Example dat File Tools Help Haze parameters Select power factor for calculation of haze parameter for transmitted light HT go po o Ea Use calibration functions CR cT Use haze input data HR HT Specify cR Specify cT cT_O5 X At specified interfaces coherent specular light coming from the front top side of the structure is scattered in transmission only 55 SunShine v1 2 8 Optical Simulator User s manual 3 Angular Distribution Functions SunShine v1 2 Example dat File Tools Help Angular Distribution Functions No of equivalent angles per 90 degrees 25 Use internally defined ADF1 Use internally defined ADF2 Use externally defined ADF1 Use externally defined ADF2 H Select ADF1 for perpendicular incidence of coherent specular beam Select ADF2 for incidence of incoherent scattered beam Angular Distribution Functions for reflected light ADF1R for reflected light ADF2R Linear 3D gt Linear 3D z for transmitted light ADF1T for transmitted light ADF2T Linear 3D z Linear dependent o
81. tion is shown in the figure In case of a cone illumination the triangular shape of linear ADF is transformed into trapezoidal shape ADF cone ill Angular distribution function ADF Scattering angle degree Use externally defined ADF2 By selecting this option you can select ADF2R and ADF2T of rough interfaces defined in external files located in lt WORKDIR gt ADF external and that can be created by user The ADF2R and ADF2T are represented by the name of the file where corresponding ADF2R and ADF2T values are specified lt workdir gt ADF_external ADF2_name ars file The name of the ADF2R and ADF2T that appears in the box does not include the file extension ars 26 SunShine v1 2 8 Optical Simulator User s manual Restrictions for the name of external ADF2R and ADF2T The name can include letters numbers and _ character e g ADF2R_TCO1 It should not contain spaces or strange characters e g etc The maximum number of characters in the name is limited to 50 Selecting external ADF2R and ADF2T By clicking the down arrow on the right side of the text box available ADF2R and ADF2T that are listed in lt workdir gt List ADF2ext dat are shown You can select one of these ADF2 data or write the name of another external ADF2 directly in the box In this case be sure that there exists the name ars file with corresponding ADF2R or ADF2T values in lt workdir gt ADF_ external folder
82. tion of scalar scattering theory that defines the HT values of a rough interface Options 2 3 and user defined are possible Note that the same value as selected here in this transform should be used later in the simulations defined by power factor in console Haze parameters Select the file with measured haze data which has to be in a standard format and txt extention The standard format is as follows no header first column wavelength in micrometers second column the haze values for reflected or transmitted light Define vertical root mean square roughness in nanometers of the interface where the specified haze data were determined This value is used in transform Define incident layer file with the nk data of the incident layer medium from which the light approaches the interface should be specified for details on selection refer to description of Structure console section on Layers For example by measuring the haze for transmitted light at glass TCO air substrate with textured TCO air interface surface the incident layer of the interface is TCO In case of haze measurements of reflected light incident medium is typically air Define layer in transmission file with the nk data of the layer medium in which the light is entering through the interface for details on selection refer to description of sie SunShine v1 2 8 Optical Simulator User s manual Structure console section on Layers For example by measur
83. ture and requirements of the files are almost equal than in the case of cal file Thus here only the differences will be explained for other requirements refer to description of cal files Example of HT_01_ZnO_ Al air tis file The first part of the file is given in following HT OT Incident layer TCO_ZnO Al Layer in transmission air No of roughnesses sr 1 lambda nm sr nm 50 300 0 0 10 310 0 0 10 320 0 0 10 330 0 0 10 340 0 0 10 350 0 0 10 The differences regarding to cal files are the two additional lines written in bold here In the first line Incident layer the name of the incident layer corresponding to the measured haze data should be given The name should follow after the colon sign at the end of Incident layer text For details on the name of the layers refer to description of layers in Structure section In the second line Layer in transmission the name of the layer in which the light is entering with the corresponding haze data should be given The name should follow after the colon sign at the end of Layer in transmission text For details on the name of the layers refer to description of layers in Structure section Note If certain tis file is included in the simulation all the discrete wavelengths of the selected input spectrum should be represented also in the tis file while for the roughnesses linear interpolation between the specified sr values is used in the sim
84. ulator 43 SunShine v1 2 8 Optical Simulator User s manual ars files External Angular Distribution Functions ADF1T ADFIR ADF2T ADF2R of scattered light as a function of discrete scattering angle fi_scat is given in ars files Further parameters are incident angle of illumination beam fi_inc and rms roughness sr of the rough interface on which the ADF was determined The structure and requirements of the files are explained on example of ADF2R_unity ars file The contents of the file is given in the following ADF2R unity Incident layer undefined Layer in transmission undefined No of scattering angles fi scat 8 No of incident angles fi inc 2 No of rms roughnesses sr 2 sr nm 50 fi_scat deg fi inc deg 0 fi inc deg 30 0 0 1 00 1 00 10 0 00 00 20 0 00 00 30 0 00 00 40 0 00 00 50 0 00 00 60 0 00 00 70 0 00 00 80 0 00 00 sr nm 100 fi_scat deg fi inc deg 0 fi inc deg 30 0 0 1 00 1 00 10 0 00 00 20 0 00 00 30 0 00 00 40 0 00 00 50 0 00 00 60 0 00 00 70 0 00 00 80 0 00 00 Header text before the line Incident layer can be changed by user but the text should not met contain colon sign In the header lines Incident layer and Layer in transmission the corresponding two layers forming the interface are defined in the same way as in case of tis files for details refer to description of tis files 44 SunShine v1 2 8 Optical Simu
85. ured haze data For determination of cR file haze data for reflected light are used For determination of cT file haze data for transmitted light are required C cR oF HT powerfactor 2 C3 Select file with haze data standart format required HT_2n0_air txt Define rms roughness of the interface nm 60 Define incident layer nk data TCO_Zn0 air Define layer in transmission nk data Specify the folder of the nk data C Program Files SunShine nk Specify the name of the cR or cT file w o extens cT_Zn0_HTpowerd Specify the folder of the cR or cT file C Program Files SunShine cT_cR Running cR_cT transform gt SunShine gt cR_cT_transform cR_cT transform calculates haze calibration functions for reflected cR or transmitted cT light at a rough interface The input data are measured haze values as a function of light wavelength for details about transformation refer to documentation Scattering parameters The transforms creates cR cal or cT cal files corresponding to one rms roughness one substrate in one file In the transform window you can select define cR or cT transform depending on which transform you want to perform For haze values for reflected light cR should be selected whereas for haze corresponding to transmitted light cT should be used In case of selecting cT additional setting for HT power factor appears This is a power factor in the equa
86. yer above or Delete layer option Maximum number of layers Maximum number of layers is limited to 40 Thickness In the corresponding boxes you can specifies the layers thickness in nanometers 15 SunShine v1 2 8 Optical Simulator User s manual No of Segm The number of segments of equal length inside the layer of a given thickness is determined With this parameter the numerical calculation grid calculation points for position axix x is determined in the layer see next example In these points the simulation results which depend on position x in the structure are given in the output files G1 jph An example of a layer with No of Segm 3 is shown in the following figure 1 segm 2 segm 3 segm calculation points The number defining No of Segm should be an integer greater or equal to 1 The total number of segments sum of all layers should not exceed 2500 Roughness rms The vertical root mean square roughness Orms or of specific interface is defined For definition and physical background of Oms refer to the documentation on Optical model and Scattering parameters Advanced Settings By clicking the button Show Advanced Settings the conditions for the incoherent analysis of specific thick layers can be viewed and set The SunShine version 1 2 enables up to three thick layers to be treated incoherently The detection selection of the incoherent layers is automatic consideri

SunShine Optical simulator User`s manual

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