VEO - FindTheNeedle.co.uk
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1. Probe amp Wedge Databases TCG and DAC Unlimited Scan Lengths WOY Sm ES GBs 19 9100 COTEU Ta Sor i E Set Ref Gain 3 C1 40 0mm 15 47 46mm C2 40 0mm 7026 47 6mm all al l5 120 25 30 15 20 z5 130 35 4850 G1W 124 5 23mm 168mm 25 3mm G2 FAIS G3 744 07mm 4 159mm 225mm G4 mm 4 mm mm 0 7mm 15 9mi 225mm x ry Sl Al A2 CaN dh i Scan G4 60 74 G3 22 74 3 3 2 i 5 G1 209 139 l 3 G2 20 ry wun _ Vcr NIA Changes the level of amplification on each channel for this scan Multi Scans The veo can be quickly configured to display a large range of multi scan views This allows the user to select the views important for the inspection and to get best use from the display Sector scan top side and end views can all be combined with multiple A Scan views and TOFD Cursors and rulers are used to identify indications in the views whilst measurement tools give size and annotation Huge File Size 3GB USB key Data Storage WheelProbe Compatible Hot Swap Battery Packs Merged C Scan Simultaneous TOFD amp PA Ray Tracing with Reflection Interface Triggering TCG DAC 16 128 addtional features Up to 128 probe elements High Power 130 volts Enhanced Multigroup up to 6 concurrent scans SetRefGain Scan NIA 7 95 02mm vellDAci index N A Changes the2. Palette Ampl Low 0 0 f Palette Ampl High Data Gate Giv Reference Gatel fo one L 4 118 251 Index Frame 1 315 A Sean 117 00 ial Scan Frame 1 Index 80 00 mm Selects the color palette used to show the amplitude or depth in views C Scan The veo offers full merged C Scan capabilities allowing the inspector to see the complete area of inspection TOP views from angled or nor mal beam inspections or C Scans from normal beam inspection can be producec based on either amplitude or time of flight data C Scans from multiple passes can be merged together This is particularly valuable for corrosion mapping and assessment of large composite structures Importantly the tyre allows excellent coupling to rough surfaces and the design allows for consistent reliable inspection in both depth and amplitude Advantages of this system include the portability relative simplicity and complete autonomy from the need for additional power sources on the inspec tion site Additionally the Veo CWP system gives the flexibility of utilising the CWP on a manual basis for small area scans e g screening of pipe work of vessels where LRUT has been used or scanning along the length Axial of the pipe veo PHASED ARRAY Pulsers Configuration Test Mode Transducer Socket Pulse Voltage Pulse Shape Pulse Width Edge Time Output Impedance Trigger Synchronisation Tx Rx Focus Delay
3. Ultrasonic Phased Array Flaw Detector Series www sonatestveo com Sonatest VeO series Power amp performance perfectly packaged The veo range of Phased Array ultrasonic flaw detectors reinforces Sonatest s reputation for innovative technician focussed product development Simple controls superior performance advanced features and rugged enclosure deliver simplicity capability and reliability to the technician s finger tips Ultrasonic Phased Array technology has become the established method for advanced NDT testing applications Phased Array techniques allow the user to control parameters such as beam angle and focal distance to create an image of the test part enhancing defect detection and speed of testing In addition using the latest computer technology data can be permanently recorded for processing and report generation The veo s robust design intuitive user interface and extensive online help brings the power of Phased Array to the field based technician Typical applications include Weld Inspection Corrosion Mapping Aerospace and Composite testing The intuitive menu system is application and workflow driven with set up and operation swiftly becoming second nature Integrated aB CAL prs 7 TW 8 f t o TE Help and Wizards guide the user through scan set up whilst Optimisation Tips ensure the veo always performs at the highest level The unique 3D ScanPlan view gives immediate
4. L Scan or E Scan X4 Series Miniature Phased Array Probes with Integral Wedge An integral wedge design which are dimensionally and ultrasonically equivalent to standard European mono element shear wave probes A good choice where a compact angle beam is required X5 Series Medium Phased Array Probes AWS High Temperature amp Deep Penetration These are low frequency high energy probes intended for fairly deep penetration applications and general testing These can also be used with the appropriate SW62XXX range wedges including the Snail and high temperature DAAH Detachable Active Array Head Sonatest manufacture a wide range of Array and Mono element probes suitable for use on the veo and other phased array flaw detectors The DAAH Detachable Active Array Head range provides a unique phased array probe solution using standard cables and a range of detachable probe heads This concept brings advantages in cost and gives the end user more flexibility in the field during the inspection process Frequency Model Number No of Elements Pitch mm Wedge MHz s _ reresomaceoer O fe O os external s____ T Pe s omeoeoaPsewop 22 os fos integral 7s mersus a oe 7s merer smoor woo o Jos TPE smao eP woo a0 fos i C C ios External 35 Integral 17 Integral WheelProbe WheelProbe CWP 05 64 08 05 veo CWP 02 64 08 05 veo Further transducer models available Enquire for full range VEO Kits amp
5. tion for rugged construction and high quality products has been earned over 50 years serving the industry The Veo is constructed to exacting standards using a rigid shock mounted internal chassis surrounded by an impact absorbing enclosure and sealed to IP66 Designed to incorporate many features to make site work easier the veo is fitted with standard camera mount fittings underneath and four attachment points on the back for tripods and other equipment accessories Additionally the four corner D rings allow the veo to be attached to carry straps or 4 point body harnesses for easy move ment and freeing hands for scanning The veo has a two battery design which are hot swappable therefore minimising down time and heightening the reliability of performance in the field UT Studio UT Studio is a PC based software which comes as part of the veo package for Phased Array configuration development data analysis and report generation Recorded veo data files are easily transferred via a network or USB data key and used to generate new views and projections Using a familiar windows drag and drop interface the user can create multiple views such as Top End and B Scan by simply dragging veo data files onto templates for display Powerful measurement cursors and extractors can added be to identify indications size and annotate defects Reports are easily generated and can be exported into PDF format for review and circulation Fr
6. Range Receivers Gain Range Input Impedance Bandwidth Data Acquisition Architecture Digitizing Frequency Digitizer Resolution Data Processing Data Recording Max A Scan Length Maximum PRF Focal Law Qty Focusing Type Processing Filters Sub sampling Rectifier Reference Scan amp Views Supported Scans Real Time Views Colour Maps Multi Group Cursors Types Measurements Spec ifications specifications are subject to change 16 64 16 pulsers receivers driving up to 64 elements Pulse Echo and Transmit Receive l PEX 50 V to 100 V in steps of 10 V Negative square wave with ActiveEdge adjustable 25ns to 1000ns 2 5ns resolution lt 10 ns in 50 ohms load 100V lt 16 ohms Encoder or free running time based 0 to 10 ps 2 5 ns resolution 0 84 dB in steps of 0 1dB 50 ohms 200kHz 27MHz 3 dB Full digital delay and sum architecture 50 100 MHz 12 bits 16 bits sample Full raw data recorded 8192 samples 32 metres in steel LW 50MHz 1 128 20 kHz Up to 1024 Constant Depth Constant Sound Path Constant Offset Smoothing Averaging Keep Max Software Gain 7 narrow bands and 3 broadbands automatic 1 1 to 1 128 RF Full Positive Negative Initial pulse or gate IFT supported S Scan amp L Scan S L B C Scan Top and End view 10 Standard amp User customisable pallete 4 scans and 1 TOFD Scan Cartesian Extraction Box Angular Path Length Depth Surface Distance D
7. visual confirmation of correct set up and ultrasound coverage even in complex multi probe applications Fast and efficient wizards for Sound Velocity Wedge Delay TCG DAC Sensitivity and Encoder calibration are all provided as stan dard Clear indication of the calibration status is provided on screen via a simple traffic light system so that operators can check at a glance that the veo is calibrated for the inspection task Menu navigation uses Sonatest s second generation scroll wheel technology for fast parameter selection with shortcut keys for the most used functions and alohanumeric entry The familiar Start Stop and Record keys switch quickly between set up acquisition and recording modes The powerful veo platform unlocks a new level of performance in a portable instrument helping you to maximize your efficiency on site The Inspection Plan shows the operator in 2D and 3D where probes are positioned on the test part simplifying the inspection setup and provid z ORAID oo o a i Probe Scan and Index Offset The distance between the group reference point and the wedge probe reference along the scan or index axis Cfg 3D Help 3D ns NIA x 1 NIA ing an inspection reference for reporting All adjustments to focal laws are instantaneous with angle resolution to 0 1 and up to 1024 focal laws without loss of performance Multiple scans from different probes may be displayed and evaluated at the same
8. 1 with 3 sub DAC per focal law in PA 16 0 to 60 dB gt 50 dB us Gates A Scan Gates Gate Trigger S L Scan Alarm LED Measurements Reporting PDF Reader GENERAL Data Storage Internal External Transfer Rate Data File size Typical Scanning Speed Typical Scan Length Display Size Resolution Colour Type 1 0 Ports USB Ports Ethernet Video Output I O Encoder Power Output Integrated Help Language Support Batteries amp Power Supply Battery Type Number of Batteries Operation Battery Replacement Battery Recharge Battery Life Enclosure Size Weight Environmental Temperature Relative Humidity Environmental Warranty Calibration Standard Vibration Shock drop Tested 4 gates per A scan 3 extracted A scans per S L scan Flank Peak 2 Extraction Boxes per S L scan 1 sync on all gates amp DACs Available in A Scan view 1D Peak FSH dB D BPL SD 1D Flank FSH dB D BPL SD Echo to Echo PDF file PNG screen captures customer logo Allows viewing any uploaded PDF document 6 GB standard Hot removable User USB8 GB standard Only limited by USB key capacity To User Key Up to 23 MB s Write mode Up to 27 MB s Read mode 3GB FAT32 file system 10 to 15 cm s 3 9 to 5 9 in s gt 10 m 32 8ft 25 9 cm 10 2 in Wide aspect ratio 1024 x 600 pixels 260k 65535 colours for scan palettes TFT LCD 3 x USB certified ports 480 Mbps Gbit Ethernet
9. 1000 Mbps VGA Analog 1024 x 600 1 or 2 axis quadrature encoder LEMO connectors Single ended and differential input 5 V 500 mA current limited Active parameter description and Optimisation Tips Six user selectable languages from English German French Spanish Russian Chinese Intelligent Li ion batteries 2 1 battery or 2 batteries DC Power pack Hot swappable no tools required Batteries recharge in unit operating or not 6 hours typical operation H220 mm x W335 mm x D115 mm 8 66 in x 13 19 in x 4 52 in 5 28 kg 11 6 Ib 1 battery 5 75 kg 12 6 Ib 2 batteries Operating 10 C to 40 C 14 F 104 F Storage 25 C to 70 C 13 F 158 F 5 to 95 non condensing Meets IP66 1 year EN12668 EN60068 2 6 Sinusoidal vibration 50hz to 500 Hz 0 5mm 18g 5 sweep cycles According to MIL STD 810F Method 516 5 Procedure IV 26 1 meter drops each face edge corner while operating to 2 inch plywood over concrete Veo 16 128 only PHASED ARRAY Pulsers Configuration Pulse Voltage Output Impedance Data Acquisition 16 128 16 pulser receivers driving up to 128 elements 50 V to 130 V insteps of 10V lt 32 ohms Trigger Synchronisation External digital input encoder or internal Scan amp Views Multi Group Up to 6 scans 6 phased array or 4 phased array with 2UT TOFD Supported Inspection Codes Other relevant Codes are also met e ASME Code Case 2235 9 Use of Ultrason
10. AC AWS CONVENTIONAL UT TOFD MONO ELEMENT CHANNELS Pulsers No of Channels Test Mode Transducer Socket Pulse Voltage Pulse Shape Pulse Width Edge Time Output Impedance Receivers Gain Range Input Impedance Filter Bands Data Acquisition Digitizing Frequency Digitizer Resolution Data Processing Data Recording Max A Scan Length Maximum PRF Processing Sub sampling Rectifier Trigger Synchronisation Scans amp Views Supported Scans Views Cursors Type Measurements 2 TX RX 2 multiplexed channels 2 RX Pulse Echo transmit receive TOFD BNC or LEMO 1 factory option 400 V adjustable from 100 to 400 V in steps of 10 V Negative Square Pulse with ActiveEdge Adjustable from 25 ns to 2000 ns resolution 2 5 ns lt 20 ns in 50 ohms load 400V lt 10 ns in 50 ohms load 150V lt 10 ohms 102 dB 30 dB to 72 dB 400 ohms Narrow bands centred at 0 5 MHz 1 MHz 2 25 MHz 5 MHz 7 5 MHz 10 MHz and 15 MHz Broadband at 1 MHz to 18 MHz 6dB 50 100 200 MHz 10 bits sample 16 bits Full raw data 8192 samples 12 kHz Smoothing Filter Keep max 1 1 to 1 128 RF Full Positive Negative External digital input encoder or internal A Scans A B Scan TOFD Cartesian Hyperbolic Path Length Depth Surface Distance DAC AWS DGS CONVENTIONAL AND PHASED ARRAY DAC Number of Points DAC Quantity Time Corrected Gain TCG Number of Points Gain Range Max Gain Slope 16
11. Accessories ee ee Cert No Q5036 Standard V o Kit Calibration Certificate UT Studio Single user licence e Conventional Views A B C D e Phased Array Views S L Scan e Viewing Reports USB Memory Stick 8GB Lithium lon Battery packs x 2 Power Cord amp Power Supply adaptor Couplant Quick Start Guide amp User Manual CD screen Protector Anti Glare Carry Strap 4 point Neck Harness Transport Case Airplane carry on size veo Kits eveo amp Magman Scanner eveo amp Corrosion WheelProbe eveo amp Manual TOFD eveo amp Manual Weld SONATEST LTD Dickens Road Old Wolverton Milton Keynes MK12 5QQ UK Tel 44 0 1908 316345 Fax 44 0 1908 321323 www sonatest com sales sonatest com Part No 147385_Iss 4_08 12 veo Accessories Splash Proof USB Keyboard Waterproof Mouse Battery Charger Tripod Lithium lon Battery pack UT Studio Professional edition QuickTrace Encoder Rapidscan to veo Encoder Adapter DAAH Array probe cable Screen Protector USB Memory Stick 8GB Phased Array Cable Y Splitter Splitter Box 32 32 or 64 64 TOFD 40 dB Pre amp Phased Array Test Block Steel Phased Array Test Block Aluminium HD15 Encoder Adapter Distributed by www sonatestveo com Sonatest
12. ee download of UT Studio Viewer is available for the technician s client Phased Array Flaw Detector CE veo 16 64 200 0 0 66mm 0 00mm 2 20mm 200 0 Xe oon View Orientation dB 30 0 0 0 Al 18 Als 12 45mm Ele 8 58mm NellWDiyiSeniTCGi FL 18 Horizontal Len 2 20 95mm Add Cursor rE View Palette Spectrum a Depth Amp Mode Depth Mode E Top Ruler JE Yes 7 pl Bottom Ruler G1 200 0 G2 200 0 11 52mm 11 52mm 0 66mm 4 0 66mm 0 66mm 0 66mm i rom EER sp TETI beek TER Pe rte No Left Ruler E h Yes No Palette Pos Right Palette Depth Low j 10 09 mm lt lt l Yor f f 16 50 Inspec 2 Probes 2 Wedges Part 2 Scans Geom i Enc MF call WPrets B Lae Display Mode Beam View Orientation Dimensions No Scan Area Yes Wire Frame Display No Cfg 3D 3D Scanplan The veo Scanplan supports multiple probes and scans enabling the set up of inspection plans from a number of sources quickly and efficiently Choose from a range of weld geometries and visualise the probes on the part in the locations you choose Multiple skip paths are shown on the 3D Scanplan allowing the user to ensure coverage for weld inspections Simple refer ence points are indicated for easy interpretation and locations of probes on the part can be quickly defined Mixtur
13. es of probe types are supported in pulse echo and pitch and catch phased array TOFD or conven tional UT The Scanplan is an invaluable reference for your inspection report communicating the results of your inspection more clearly and saved as part of your inspection for future use www sonatestveo com inspection Mek Laaa ETES Scan 25Geom REnc E S e tas tet e s o ls L E aS 5 z Select Layout 7 Report Fy a oe et A T n a Fa G1 49 87 GETTA 8 8 a Lock Setup No 7 ShortMenu 3 a i we a Index NJA Enter the measurement selection menu TOFD The veo has a dedicated analogue architecture for TOFD inspection using analogue filters developed from the Sonatest range of flaw detectors Coupled with the lowest noise amplifiers high speed data acquisition and a high definition display superior quality TOFD scans can be viewed live at the same time as Phased Array Phased Array and TOFD inspections can be evaluated together for added confidence during weld inspection Built in evaluation tools such as straightening and lateral wave removal allow quick and accurate evaluation of the TOFD inspection which can be included in a test report Superior Imaging Full Data Recording Fast Encoded Scans Multi Scan Simultaneous UT amp PA Instant Focal Law Calculations Easy Report Generation IP66 Enclosure Calibration Wizards 3D ScanPlan
14. ic Examination in Lieu of Radiography e ASME Code Case 2541 Use of Manual Phased Array Ultrasonic Examination Section V ASME e ASTM E2491 Standard Guide for Evaluating Performance Characteristics of Phased Array Ultrasonic Examination Instruments and Systems e ASTM E2700 Standard Practice for Contact Ultrasonic Testing of Welds Using Phased Array e CEN EN 583 6 Nondestructive testing Ultrasonic examination Part 6 TOFD as a Method for Defect Detection and Sizing e BSI BS7706 Guide to Calibration and Setting Up of the Ultrasonic TOFD Technique for the Detection Location and Sizing of Flaws Phased Array Transducers X Series Building on the Phased Array instrumentation range from Sonatest Ltd the X Series of transducers now offer the operator a broader choice in range and frequencies together with the assurance of industry standard configurations These X Series phased array probes have an integral 2 5 metre cable and an IPEX connector compatible with the Sonatest veo and other leading phased array testing equipment X1 Series Miniature amp Sub Miniature PA Probes The X1 models are small probes for aerospace and limited access work Key applications include Scribe line in spection X2 Series General Purpose PA Probes This is a general purpose compact probe design suitable for sector scanning applications X3 Series Long Array Probes for Electronic Scanning These probes are ideal for Linear Scanning applications
15. level of amplification on each channel for this scan A Scan The veo supports traditional ultrasonic testing with mono transducers The high definition LCD and fast graphics rendering ensure high levels of accuracy and a fast interactive waveform display Thanks to the high resolution of the LCD display measurements are clear and easy to read and the wide screen for mat provides a huge viewing area for the scan The A Scan display ensures the peak signal is always displayed so that you never miss a defect veo 16 128 2 Sectorial PE Gali 4 Sectorial PE Gai S1 TOFD Gain G1 FSH 4H1 H2 Dist Scan H1 H2 Dist 3 54 0dB 82 60 0 dB Od 16 26 59 1 27 60 mm 1 04 mm FILE 12 03 20 ol Ruler LW Pos 9 78 ys Ruler BW Pos 1L55ys TX paa gt RX Straightening poe i 2 n ms Scan Framel if EA ee 1 201 N A Time distance that represents the position of the lateral wave theoretical a a tN Aco 12 07 31 Part D File Name L Example_2xSectorial_Facing_1xTOFD_SingleV utcig Inspection L inspection 115 21 KB por frame der oder 1D Encoded Expected File Size 11 36 MB Probe Wedge Probe 1 1D 32 Elements 5 00 MHz W Rotation model Sonatest T1 PE 5 0M32E0 8P f Wedge 1 Angular Planar Cut Angle 35 00 te Probe 2 1D 32 Elements 5 00 MH i i Probe Wedge 3 amp Model Sona
16. test T1 PE 5 0M32E0 8P Wedge 2 A Planar Cut Angle 35 00 L adenetesd f rare 4 9mWAM DEVAS Probe Scan and Index Offset 00mm The distance between the group reference point and the wedgelpi Enc Area CL Pos Enc Area CL Offset the scan or index axis 0 00mm Enc Area Rotation Index NIA Translate the probe in the x axis according to the origin Center Line Stop Mode In stop mode the veo system is able to display four screens of information simultaneously For example a Configurations Summary Help Page Plan view of Inspection showing expected probe movement 3D Scanplan showing the probes parts inspection beams and planes of focus as above Any one of these can be maximised to a full screen view Veo amp Corrosion WheelProbe Scanning Systems The Corrosion WheelProbe is a tried and tested solution for corrosion mapping and can be combined with the veo and scanning system to provide simple and effective scanning solutions in this field The scan width is close to 50mm in one pass and can be used on diameters from 12 120cm 4 48 in G1 1I11 Gl FSH Gil t G1 l Start Gl l Stop G2 FSH P 5 01mm 1 127 3 873mm 3 95 mm 14 27 mm 91 5 u dB 29 7 0 0 S Al 48 Als 12 50mm Cl 96 82mm i CG ise Select Layout C24 12 51mm_ E21 82 08mm E14 000mm View Orientation ny Vertical Top vE Add Cursor Y Palette Properties View Palette Palette Pos j
17. time Multiple sectorial scans true top side and end view extractions plus C Scans are all supported by the veo TOFD and Phased array inspections can be carried out in tandem at full scanning speed and with up to 3GB data files large areas can be inspected more efficiently Full resolution waveform data can be stored directly to a removable USB data key for ease of back up and transfer to PC The veo has two dedicated mono element flaw detection chan nels for conventional UTand TOFD inspection Based on Sonatest s Masterscan flaw detector the channels have 400 V pulsers Time Corrected Gain and low noise amplifiers for the most demanding applications An impressive hardware specification provides high quality ultrasonic data via a full 16 bit high speed architecture and 12 bit ADC technology Digital signal processing enables smoothing and averaging enhances image interpretation Measurement and sizing of indications are quickly achieved using advanced measuring tools such as Hyperbolic Cursors for TOFD For any flaw detector the display is a crucial element The Sonatest veo range has a colour transflective TFT LCD providing high visibil ity in all conditions with the highest display to size ratio of any field instrument Reliability Robust design and proven reliability are essential attributes in demanding NDT environments Down time is expensive and should be minimized to ensure maximum productivity Sonatest s reputa
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