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Micro cantilever 取り扱い説明書

1. the less auto fluorescent in order to avoid the cantilever being contaminated Handling under an ionizer is recommended cantilever doesn t obscure the light from the fluorescently stained samples of interest It 2 Avoid wearing clothes like woolen sweaters fleece etc that give off the static electricity when also makes the cantilever alignment to the point of interest easy handling the cantilever cases and chips Use of an anti electrostatic mat and wrist band is preferable See th ificati heet of OLYMPUS Mi til t the last f thi k Ss E EE Ga esa a 3 In opening the case put the plastic case label side down on a desk Table of contents page The cantilevers are tip side up as viewed in the case 4e 4 Open the case 4 0 8e 4e f ef 49 Picking up the cantilever chip from the case Caution lk Ol 49 a Avoid any contact with the cantilevers when you pull up the cantilever tip from the case fe alle cq 1 Pick up the chip by the long side with the tweezers and mount it in the AFM m vn Tetrahedral tip in two stage structure The apex of the tetrahedral tip becomes sharper due to an oxide sharpening process The tip angle in the final few hundred nano meter of the apex is about 15 to 25 degrees see below A two stage structure is employed in this probe Head of the probe tip laiis see left illustration The head of the probe tip is made of silicon and
2. Foot of the probe tip r Silicon beine awerod tetrahedral in shape The foot of the probe tips is with silicon nitride film also made of silicon but covered with a silicon nitride film There is a discontinuity in the probe shape midway between base and apex The measurable sample height therefore limited to the height of Tetrahedral tip in two stage structure the tip 3 5 micron 15 25 deg 15 25 Front view Side view o Haia t As can be seen in the left illustration OSES Aer ae eee ana a tetrahedral tip is located near the triangular end Sharpening nido around Lip apes of the cantilever When observing the cantilever When you set your samples to your instrument please consider the unique shape of the from the reflex side a triangular pocket can be tetrahedral tip that is good symmetry when viewing from front side and choose the direction seen near the free end of the cantilever marking of the sample When measuring long grooves you can get an idea of what angle of the cut will the base of the tetrahedral tip Operators can be quickly by aligning the cantilever along the grooves and scanning across at right angles therefore easily locate the tip position relative to against grooves see below Tip side down Triangular Pocket 2 5 A step exists between the samples under optical microscope observation by lever and the dump i finding the center of the triangular pocket This makes alignment of the tip
3. sharp apex will contribute to Use of anti electrostatic discharge mat and a wrist band is recommended your high resolution measurements The tip apex is made of silicon with a tetrahedral A For inspection Stereo microscove shape ideal for achieving a point terminated tip The apex is further sharpened with our exclusive sharpening process Open the case The tip is a two stage probe Whole tip height is 7 micron and the effective tip height is 3 5 micron longer than the tips of Olympus OMCL TR RC series The long tip makes it possible to measure relatively large samples like bio cells 3 Pre separated Chips The chips offered in tac carrier case are separated in advance The chips can be used in AN Caution Please handle our cantilevers carefully because they are fragile Caution It is recommended that precautions be taken to prevent damage to the AFM as soon as the case is opened 4 Gold reflex coating Gold Chromium showing high reflection is employed as the reflex coat material Good S N ratio can be expected in optical deflection sensing 5 Small auto fluorescence cantilever tips from electrostatic discharge Auto fluorescence light from the silicon nitride cantilever is lessened comparing to Olympus OMCL TR RC series silicon nitride cantilever 1 It is recommended that the cantilever case be opened in a clean environment like a clean bench In AFMs combined with a fluorescence optical microscope
4. Cantilevers vibrate a little in water due to Brownian motion noise Such noise should be observed Those spots align in the direction corresponding to the transverse direction of the minimized in force curve measurements for research of folding mechanism of DNAs proteins cantilever axis etc Small size cantilevers show small Brownian motion noise and give good signal noise ratio in the measurements Solution Adjust the optics of the AFM sensor to locating the primary spot to the center of the 3 Merit of small auto fluorescence cantilevers photo detector i l In AFM measurements of biological samples AFM combined with a fluorescent optical Primary optical spot microscope is useful After recognizing fluorescently stained samples with the optical microscope a cantilever probe would locate to a point of interests on the sample Conventional Optical spot first order silicon nitride cantilevers sometimes obstruct fluorescent optical microscopy of the sample O because of the large auto fluorescent light generated from the cantilever This cantilever probe has a far lower auto fluorescence output which will not obscure your fluorescent sample Quadral photo detector Reflection light to the photo detector Illumination light Scattered light Scattered light 3 l j Please contact following if you have any question on this user s manual 6 Tips for better measurements _ OLYMPUS CORPORATION Microtechnology
5. Micro cantileverf user s manual Thank you for purchasing OLYMPUS Micro cantilever Please read this manual carefully before use lt Explanation of the each part of the products gt Cantilever chips in a plastic case are included in the envelope with manual and spec sheet Manual and Spec sheet Plastic pack blue colored Label Inside Plastic case Cantilevers are in the case Cantilever chips are contained in the plastic case Tac carrier Adhesive sheet Cantilever chips Upside Case Tac carrier Down side Cantilevers are tip side up P Case Label Case closed Tape as viewed in the case Magnified illust Case open Products name BL ACAOTS C2 Lot Number Loia z Kesonant frequency 110 _ kHz Spring constant 0 09 Nim blips fiwaw olvmpus co Jp probe OLYMPUS Inspection stamp One cantilever is elongated from the side of round shoulders of the chip OLYMPUS le Please obey the following to the OLYMPUS micro cantilevers Warning Use protective eye glasses when handling to avoid damage to the eyes from breakage of the cantilever chips AN Caution Please handle our cantilevers carefully because they are fragile Caution Do not drop or shake the cantilever case Even when the cantilever chips are contained in the cantilever case the cantilevers may break if the case is handled roughly or jarred AN Caution It is recommended th
6. R amp D Division 1 Merit of using cantilevers with a high resonant frequency Resonant frequencies of the cantilevers decrease by factor of 4 to 5 in water because of the 2 3 Kuboyama cho Hachioji shi Tokyo 192 8512 Japan water around the cantilevers The lower resonance cantilever forces operators to wait for a long time to acquire an image due to a slow scan speed BL AC40TS C2 with a high resonant email probe olympus co jp frequency of 25 kHz typ in water while being soft with spring constant of 0 1 N m enables the fast imaging of biological samples in water Of course scan speed is deeply dependent on the performance of the scanner and measurement samples If a small and robust scanner with high resonant frequency is used one can expect 5 Hz line scan frequency in AC mode AFM Please access to the web page of OLYMPUS micro cantilevers measurements in water while 0 5 Hz with conventional silicon nitride cantilevers http www olympus co jp probe In observing a sparse biological sample on a substrate a large area e g a 10 micron square is scanned to locate a target of the sample High speed cantilevers are timesaving device for AFM measurement particularly in the aiming procedure Even with a slight improvement in the scan speed by a factor of two or three high speed cantilevers are worth using because they Ver2 0 J Ba a009 er 2 une 22 OLYMPUS CORPORATION reduce the time required for observing such large areas before i
7. at precautions be taken to prevent damage to the cantilever tips from electrostatic discharge AN Caution Be sure to store the cantilevers at room temperature and moderate humidity Caution When discarding please obey the laws and regulations in your country and or your company These cantilever are made of silicon silicon nitride gold and chromium 2e Special feature of OLYMPUS Micro cantilever BL AC40TS C2 BioLever mini raor Oe otea ee 1 Please prepare the followings before using OLYMPUS cantilevers i g This cantilever probe is designed for AC mode AFM measurements in liquid The 2 To gain a better understanding of how cantilevers and chips are connected cantilevers cantilever has been reduced to the minimum practical size for the optical beam deflection should be inspected under the microscope sensors in most commercially available AFM This small cantilever has a nominal spring 1 Work environment ieee constant of 0 1 N m with a resonant frequency of approximately 25 kHz in water or 110 Use of an electrical charge neutralizer of ionizer is recommended 2 For hazard avoidance Protective eye glasses 3 For cantilever treatment Tweezers kHz in air The higher frequency in liquid allows faster imaging of soft biological samples and the short lever give a higher lever sensitivity with optical beam deflection sensors 2 Sharp tip The tip apex is sharp with tip radius of 10 nm Ave The
8. ncreasing magnification High speed cantilever is a key to improve efficiency of the study in your lab Je 10e
9. oid rotation of the chip substrate in your chip holder rightly on the cantilever deforcused The cantilever chips should aligned straight in the cantilever chip holder o l In clipping the chip the chip should slide ahead a little The position of the spot on the cantilever should be adjusted as shown in the diagram left below If the spot is positioned at the extreme end of the cantilever the laser may scatter than usual to avoid contact of the holder to the sample If your chip holder uses L shape wire for clipping a chip the corner of the wire may hang over the clipping wire bar after repeat use A cantilever chip in a chip holder Then adjust the level of the AFM sensor head in the AFM and make the AFM sensor free end fix end head and scanner parallel In this procedure use of a small water leveling bottle is I effective It is important to minimize the tilt especially in the transverse direction lt lt x across the cantilever axis AFM sengor head Gy a Scanner lt lt thereby reducing the total incident light on the photo detector leading to a small SUM value In case sensor light spot illuminates middle of the cantilever AFM equipment Te Case 5 By placing a piece of paper in front of the photo detector of my AFM sensor head for 2 Merit of low thermal noise cantilevers studying the position and the shape of the sensor light several interference light spots are
10. osition may have moved with time because of thermal drift in your AFM Solution equipment After the equipment is switched on allow some time for thermal As far as we examined most commercially available AFMs display a SUM value of 3 equilibration and a stable instrument to 4 volts even in the light spot shines center of the cantilever This is due to the small size of the cantilever which is as large as the light spot Try to adjust the focus of the sensor optics again The adjustment might improve the SUM value If possible the adjustment should be done in the same environment as that of measurements The chip is 0 3 mm thick If you have used different type of cantilever chips before for instance with a chip thickness of 0 5 mm the spot may be out of focus on the cantilever If possible adjusting the focus of the spot in the focal depth direction might the Case 4 I have used this tip to image a standard flat grating pattern However the images improve SUM value has a high degree of curvature with the center of the image appearing brighter higher and ee sinking down at the edge of the image Solution With using AFM equipments with a sensor head supported by a tripod mechanism a cantilever chip shoulder might contact to the sample surface before the cantilever itself contacts This is due to use of short cantilever in the AFM which the sensor head In case sensor light spot is focused In case sensor light spot is Av
11. with sample very easy in AFMs combined with optical microscopes The tip profile is symmetric with a half tip angle of 18 degrees macroscopically see left below The side tip profile is asymmetric with a tip angle of 35 degrees When the cantilever chip is attached to a chip holder in your AFM with an angle about 10 degrees the asymmetry is improved see right below Trouble shooting guide Situations as described below may arise when using this type of cantilever 10 deg Case 1 I tried optimizing imaging parameters first in air before However good parameter 10 deg Scan line profile 18 deg Scan line profile values cannot be found and the cantilever oscillated Solution From the beginning try to optimize the measurement condition in water e g sensor optics cantilever sensitivity I gain P gain and frequency tuning Selecting a smaller oscillation amplitude of cantilever for AC mode AFM measurement Front view Side view may gives better images because the tip is sharp and the cantilever is shorter than conventional cantilevers 5e 6e Case 2 When adjusting light spot position on the photo detector of AFM sensor head SUM value indicating total incident light to the sensor was small and rose to only 3 volts Eight Case 3 The SUM value changes gradually with time Solution volts can usually be expected with cantilever with a reflex metal coating The spot p

Micro cantilever 取り扱い説明書

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