FEE 131016 Critical Considerations for Probing
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1. Critical Considerations for Probing Result of Floating Measurements with Ground Connection 2 al 247 gt 22 Critical Considerations for Probing roog Tektronix driven by technology How Probes Affect Your Measurement Critical Considerations for Probing OOO Tektronix _ driven by technology Probes Will Affect Your Measurement Signal Source Loading Measurement system s impedance is critical Input Resistance Input Capacitance Inductance Signal Fidelity Measurement system parameters also crucial Bandwidth Rise Time Good Signal Fidelity Minimize affect on the original signal 24 Critical Considerations for Probing m Tektronix n iven by technology N Signal Source Loading When the probe is connected to the DUT the probe will draw some current impedance values of the probe and scope will affect the measured signal The Measurement System impedance Z consists of Resistive Elements Resistance H Reactive Elements Capacitance C and Inductance L which vary over frequency Good probe design uses R L and C elements to influence signal fidelity attenuation and source loading over specified frequency ranges Test Point Measurement System Probe and Scope Tektr2. N tmi Ej A l a a P hop ie j Jm p ou 9 Sm ih il FE mE See peep 8 uat m K za Bod ud he m l q img a Ampilan 522 F mur oadm mimi mih 1 qu a 1 ma Rails TET pE FENA E H ma L 1 sls set ped pus ixi 127 1 123 1g 2 FR uad b ad r ores is Boys d 1 PEN 1 ad a M FT Th 22 PL IN Ts qm 4 i Seas ES 1 0 Lam liia It aes La pics L 2 PRITI TIT ill EIS driven technology
3. C OO Tektronix CAN is a differential BUS CAN High Speed Differential Bus Signal dominant Electronic Control Unit CAN Controller CAN Physical Layer A 12 Critical Considerations for Probing OO g Tektronix driven by technology Differential amp Floating Measurements Adifferential measurement is the difference in voltage levels between two input signals Forafloating measurement neither input 1 at ground potential Differential Measurement Floating Measurement m I aS 5 m TEM Earth Ground Earth Ground L V Single ended Measurement V Single ended Measurement V Measured Voltage between 2 probed points Vumeas V Inverse V V Offset Voltage above true ground Meas 19 Critical Considerations for Probing OQ g Tektronix iven by technology Differential Measurements with Single ended Probes Poor CMRR Inaccurate measurement combination of offset and gain Noisier measurement Skew Amplitude and timing errors Vi 1 Different Offset or gain Tektronix onsiderations for Probing iven by technology Deskew is a Source of Error Deskew is important when measuring Pseudo differential CH1 Inv CH2 Timing Propagation Delay Include Probe adapters in deskew adjustment If possible use the same probe family F
4. 250655 ET 4 A 125m v Critical Considerations for Probing Tektronix _ driven by technology Signal Fidelity Bandwidth Limitation Complex signals contain many spectral components that cumulatively form a signal over time Spectral components are sine waves at varying frequencies and varying amplitudes which are added together to collectively form one signal accurately characterize your signal follow the 5 Times Rule BW of system gt 5 x Fundamental Frequency Fundamental 155 Harmonic mes 3 Harmonic 58 Harmonic Fouer Square Wave 14 5 Tektronix Pere J 40 Critical Considerations for Probing Signal Fidelity Bandwidth Limitation 30 Amplitude error is true for a repetitive sine wave Actual Signal Amplitude Frequency 41 Critical Considerations for Probing driven by technology Signal Fidelity Bandwidth Limitation Insufficient bandwidth affects the signal Why is the front edge affected The front edge contains the high frequency content f the measurement system doesnt have enough bandwidth it wont capture the high frequency portion of the signal 3 E 10 The signal bod delivered to the lt oscilloscope 3076 wj Insufficient BW Frequency gt degrades the front edge 42 Critical Considerations for Probing driven by technology
5. probe x Standard with 350 MHz 500 MHz models P6139A step response showing longer settling time lower bandwidth TPP1000 1 GHz passive voltage probe Standard with 1 GHz and 2 GHz models Multiple ground connections included Six inch ground lead Short spring clip ground leads AC calibration routine optimizes frequency response Application usage Digital system debug Half the loading with twice the bandwidth 1 841 06 Wap 520 Critical Considerations for Probing Low Capacitance Passive Voltage Probing automated Procedure frequency response adj u SI m e nt atten TX Compensation SET ur High accuracy results Critical Considerations for Probing Tektronix driven by technology Probe Specifications Voltage Probes Passive Probes Voltage Probes Specifications Type Cable AttenuationBandwidth at System Input Typical Max Voltage Length 3 dB Resistance Input C 1X Passive Probe P6101B 2m 1 15 MHz 1 100 300 Vnus CAT 10 Passive Probes P3010 2m 10 100 MHz 10 MO 13 pF 420 Vnus CAT I P5050 1 3m 10 500 MHz 10 MO 11 1 pF 300 Vams CAT II P6109B 2m 10 100 MHz 10 MO 13 pF 420 V CATI P6015A 3 0m 1000 75 MHz 100 MO 3 0 pF 20 000 V Differential Probes Type Cable Attenuation Bandwidth Differential Differential Max Length at 3
6. to the device ws 5 0mAldiv Tektronix TCP0150 AC DC Current Probe 150 A DC to 20 MHz 9 Critical Considerations for Probing roog Tektronix es driven by technology Logic Probes The MSO4000B Series Oscilloscope offers 16 digital channels Recommend the P6616 digital probe 16 Channels 2 Groups of 8 channels First coax in each group is colored blue for easy identification otandard automotive spade connection for the common ground 3 pF loading 10 Critical Considerations for Probing Tektronix cari driven by technology ICapture One Connection for Analog and Digital 4 Tektronix MSO 72004 M Si hi iCapture Analog Acquire digital channels with digital time resolution 80ps a M E Simultaneously route any 4 digital channels to analog channels N 2 a Ec Validate signal connection NG lt l Check signal integrity Validate logic threshold Improve timing resolution r 9 Digital d v L JL JL ful Digital Channels Analog Mux Analog Channels Full Bandwidth Analog Critical Considerations for Probing Probe Selection Criteria Tektronix driven by technology Whal Is Your Probe Selection Process The first one you spot in drawer Distract a co worker and take theirs 13 Critical Considerat
7. 4 OK cem Cancel kc dl Critical Considerations for Probing sample 83 acqs RL 1 0k Auto August 17 2009 eee E 18 J Ups p Selection of different probe tips Clean signals high fidelity with the best probes available Optimize performance for the signal path scope probe tip BGA Chip Interposer for Oscilloscopes or a E Fiy lt r p OP pr NR sh a E gi n r TR a at Unique Socket Design allows for multiple chip exchanges Solder in version is also available Recommended probes P7500 Series New TriMode solder tips matched to Interposer order 020 3022 00 nterposer has embedded 1000 resistors near BGA balls in place of probe tip resistors Designed as a Probe Interposer System Critical Considerations for Probing Tektronix dt driven by technology BGA Chip Interposer for Oscilloscope BGA Chip Interposer with and without Chip Socket Component Interposer on DDR Module ve 7 3 ES 3 i 4 4 E 4 4 4 4 a 4 t 4 LI d Mu 4 4 t M A UA R U UPPUO 1 a a a A i B 1 n I Interposer with Probe Tip for DQ DQS Component Inter
8. Critical Considerations for Probing TekVPI Highlights Comp box controls provides easy and convenient access to controls and indicators plus Enhanced gain compensation increases accuracy Stored propagation delay speeds critical deskew procedures Auto degauss and probe offset autozero insures repeatable measurements Advanced Remote Control is ideal for manufacturing test applications TekVPI to TekConnect Adapter Critical Considerations for Probing Breakthrough in Passive Probing Mechanical rest ASIC Probe Perfect Match Custom ASIC inside the oscilloscope is matched to the probes Probe notifies oscilloscope what type of probe it is TekVPI Sets input in oscilloscope to special path not 1MO or 50 Q Scope can optimize signal input path to remove differences in hardware AC compensation across frequency band Mechanical keying so TPP0500 and TPP1000 cannot be plugged into an oscilloscope without the matched ASIC Critical Considerations for Probing OCG Tektronix iven by technology Low Capacitance Passive Voltage Probing TPP1000 step response with greater Industry leading 3 9pF capacitive loading bandwidth and improved flatness File Edit Vertical Digital HoriziAca Trg Display Gursors Measure Mask Math Analyze Help TPP0500 500 MHz passive voltage
9. Voltage Probes Bandwidth Limiting Filters 43 oome voltage probes provide bandwidth limiting filters to remove unwanted high frequency signal content Gritieal Gensideratiens fer PreBing i EN BANDWIDTH AUDIBLE OVERRANGE FULL m 5 OVERRANGE Tektronix P5205 100 MHz High Voltage Differential Probe OUTPUT 25V MAX INTO IM 2011 Tektronix 3 1 1 driven by technology Current Probe Degauss Removes residual magnetic flux from probe s magnetic components High impact of measurement result blue current waveform before and after degaussing Capability of measuring DC Hall Element and AC Signal Components simultaneously TCPMM iarrann Pea Amw Opan W 4 Menu Critical Considerations for Probing File Edit Vertical Horiz amp cq Trig Display Cursors Measure Mask Math MyScope Analyze Utilities Help Lr am oe nar rn d A maar a tal 1090 8 500 1MQ 8 120 frd Aur P m PH Gu qr e apa 62 acqs Auto June 04 2010 l MA deserve ANS Fur A A th Ved wis am s AP m M w J 20 0us pt RL 1 0k Probe Setup Probe Calibration Deskew Atten
10. dB Input Input C Nondestruct Resistance Voltage RMS ADA400A X 100 1 MHz 1 55 pF X 10 X 1 X 0 1 P5200 7 1 8m 50 25 MHz 4 7 pF N A 500 P5205 1 8m 50 100 MHz 4 7 pF N A 500 P5210 1 8m 100 50 MHz 8 MQ 7 pF N A 1000 P6246 1 2m 1 400 MHz 200 1 pF 25 V 10 P6247 1 2m 1 1 GHz 200 1 pF 25 V 10 TDPO500 1 2m 5 500 MHz 1 MQ 1 pF 100 50 Critical Considerations for Probing Compensation Read ID Gnd Tip Head Range Out Style NA 5 mm Min 10 to 15 pF X 5 mm Min 16 to 22 pF X 3 5 mm Comp 15 to 35 pF X 5 mm 7 to 49 pF HVP Differential Common Typical Interface Input Mode Input CMRR Style Voltage Voltage 10 V 0 01V gt 80 dB at TEKPROBE 10 V 1V 10 kHz 40 V 10 V 40 V 80 V 1300 Vnus 1000 Vrms gt 50dBat CAT Il 1 MHz 1300 Vrams 1000 gt 50 dB at TEKPROBE CAT II 1 MHz 4400 Vnus 2200 Vrms gt 50 dB at TEKPROBE CAT 1 MHz 850 mV 7 V gt 60 dB at TEKPROBE 18 5 V 1 MHz 850 mV 7 V gt 60 dB at TEKPROBE 18 5 V 1 MHz 42V 35 gt 60 dB at TekVPI 1 MHz 42 V DPO O000 nood driven by technology Tektronix Differential Probe Capabilities oelectable attenuation factors Excellent CMRR capabilities Low noise floor Heduced probe loading effects selectable bandwidth limiting filters DC Reject AC coupling to eliminate the DC offset in the measured signal Hemote access and control Versatile DUI connectivity accessories omall Probe he
11. 0 MHz BW Equivalent Probe Tip Rsource 50 T rise 1 ns 1 L around lead nu _ TT 0 05 0 1 uH combined typical For a 10X Active Probe with C 1 5 pF and a 6 Ground Lead and 6 Ground Lead Ring Frequency Using a 1 5 pF Input Capacitance 10X High Z Active Probe Ring Frequency LS Tektronix Pere Critical Considerations for Probing Calculating Resonant Frequency Resonant Frequency LC In practice the resonant frequency should be gt 5 times the signal s BW equivalent based on rise and or fall times This gives a guideline to the maximum inductance or maximum allowable probe connection loop Rules of Thumb L 20 nH inch for typical lead lengths around 0 3 probe tip and ground lead C Probe rated C plus 1 to 2 pF inch of added lead length probe tip Critical Considerations for Probing OQ Tektronix iven by technology Probing Tips and Tricks Ground Lead Length Effects 31 _ _ _ _ 3 Ground Lead Critical Considerations for Probing 6 Ground Lead O07 _ s Kk AL No Ground Lead lektronix Signal Fidelity Rise Time Insufficient rise time also affects the signal accurately characterize your signal follow the 1 5 Ru
12. Critical Considerations for Probing ay JO E Tektronix Agenda ypes of Probes Probe Selection Criteria How Probes Affect Your Measurement Choosing a Probe 2 Critical Considerations for Probing OOO Tektronix 9 _ driven by technology Types of Probes Tektronix driven by technology Probes Critical Elements of the Measurement _ gt The oscilloscope probe makes the physical and electrical connection between the circuit and the oscilloscope gt The correct probe is critical to measurement quality gt poor choice will result in incorrect or misleading measurements gt There are three defining characteristics for choosing the right probe Physical attachment Connectivity Minimum impact on circuit operation Signal Loading Quality signal transmission to the oscilloscope Measured Response 4 Critical Considerations for Probing Basic Probe Types Voltage Current Logic Optical Passive Passive Passive Active Active Active 20 High Z Differential AC DC AC High Voltage Single Differential Ended 5 Critical Considerations for Probing m Tektronix Passive Voltage Probes Most basic probe with no active components Available in 1X 2X 10X 100X and switchable Advantages nexpensive Mechanically Rugged Wide Dy
13. D Input Capacitance capacitance Probe Probe Tip INQ smaller input capacitance higher probe impedance less loading Source As signal frequency increases Rouco nix le 100 pF 220 nsec 22 nsec If Reource 1 Ci 1 OpF CU gt LLI Cin L L Tektro 1 E driven by technology we UU v v V VS Jp S S S S S S B9 S VV s _ LI LII IIl L SE LLL LL tT Tt A A Effects of Input Capacitance 100 90 10 0 R Ground Lead _ j j T T Source Signal Critical Considerations for Probing _ ous 10 0 100 90 27 Source Loading Inductance The longer the ground lead the higher the probe inductance Keep ground leads as short as possible to avoid ringing Source Signal 28 Critical Considerations for Probing Tektronix Resonance How Does Added Inductance Affect the Measurement Of 1 ns 35
14. T4 3 10 1 5 in TCP305 DC to 50 50A 100A N A 2kHz 25A 500 A uS 7 ns 0 0350 Insulated 3 8 mm 1 5m 5 AM 5 AM Wire Only w TCPA300 10A V 0 15 in NA 10A V 10 AV Direct Connect Current Probes TCPOO30 to 120 50A 84 5kHz 50 A uS 5 0 08 O Insulated 3 8 mm 2m TekVPITM 14 5 ns Wire Only 0 15 in 30 A 10 A V 5 500 18 10 A V TCPOO30 0 5 to 20 20 2 50Hz 1 2kHz 30 A 0 5 A S 30 3 kV 38mm 2m w CT4 24 5 ns 1 5 in TCP0150 20 150A 424A 2kHz 25 3 000A uS 0030 600 Vnus 2m 21 mm x 5 AN 5 AV 5 AN 17 5 ns amp 1 25 mm 150A 15 000 5 uS 50 A V 300 Vams 0 83 x 1 0 in 50 A V 50 A V CAT 111 TCP202 to 50 50A 40A 20kHz 15 500 15 f Ons 0 070 300 V 0 15 in 12 2m x TekProbe Tektronix u y ii y How do probe serial digital buses Digital buses are not digital Digital signals do not necessarily have only two discrete levels Digital probes are not digital Everything you know about analog probing still applies Minimize DC and AC loading Voltage measurements are always differential Minimize lead inductance Bus and Waveforms display of I C signal The real signal must be delivered to the oscilloscope s hardware or software comparator where it can be compared to the digital threshold value s Critical Considerati
15. ad otatus Indicator Critical Considerations for Probing TDP Probes iven by technology Differential amp Floating Measurements Critical Considerations for Probing 54 Characteristic TMDP0200 THDPO0200 100 Attenuation 25X 250X Differential 250X 750 V Voltage 25X 75V Common Mode 750 V Voltage gt gt Max Input Voltage 550 V CAT 300 V CAT III Bandwidth 200 MHz lt 275 5 1 250 gain Input Impedance at the Probe Tip Sui gt 80 dB 1 MHz gt 60 dB 3 2 MHz gt 30 dB 50 MHz gt 26 dB Common Mode Rejection Ratio Cabie Lengin 1sm ism im 50X 500X 100X 1000X 500X 1500 V 1000X 6000 V 50X 150 V 100X 600 V 1500 V 6000 V 1000 V CAT II 2300 V CATI 600 V CAT III 1000 V CAT 0 650 V ns 2500 V ns 1 500 gain 1 1000 gain 10 MO 2 pF 40 MO 2 5 pF DC gt 80 dB DC gt 80 dB 1 MHz gt 60 dB 3 2 MHz gt 30 dB 50 MHz gt 26 dB 1 MHz gt 60 dB 3 2 MHz gt 30 dB 50 MHz gt 26 dB Tektronix _ driven by technology TCP0030 AC DC Current Probe Accurate and simplified current measurements TCP0030 AC DC current probe Wide Dynamic Range Measures 1 to 30A DCto 120 MHz Bandwidth Captures high frequency harmonic components TekVPI Probe Archite
16. cture Connects directly to the DPO7000 Series oscilloscopes User setups controlled via the Probe Compensation box buttons and LED indicators or via the easily accessible Scope Probe Menu Remote programmable probe control via GPIB USB or Ethernet Critical Considerations for Probing Tektronix driven by technology TCP0030 AC DC Current Probe Fie Edit Vertical Horiz amp caq Trig Display Cursors Measure Mask Math MyScope Analyze Help TEUS pH I T 10 5 0s 5 034 100 055 10 0us pt 500 5 0ms 11 35 11 45 Preview Single Seq 0 acqs RL 5 0M Man October 17 2010 04 45 15 Critical Considerations for Probing rood Tektronix driven by technology Current Probes Specification Il Current Probes Bandwidth Peak Max Derate Derate Amp S Current Div Rise Insertion Max Max Cable Hz to MHz Pulse Below Above DC Product Display Time Impedance Barewire Conductor Length Range 1 MHz Voltage Diameter TCP300 and 400 Series Products For TekConnect and Standard 50 Q 1 BNC Oscilloscope Systems TCP312 DC to 100 50A 60A 50 50 5 5 35ns 0 080 Insulated 3 8 mm 1 5m w TCPA300 1 A V 1 A V Wire Only 0 15 in 10 A V 30 A 500 A jiS 10 A V 10 A V TCP312 0 5 to 20 20 2 50 Hz 1 2kHz 20 0 5 A S 20 AWV 17 5 2 5mQ 3 kV 38 mm 1 5m using C
17. ions for Probing Tektronix ne driven by technology Whal Is Your Probe Selection Process Original signal Signal at probe tip is changed Signal at the oscilloscope Signal display with DSP correction Deliver a Signal to the Scope with Good Fidelity 14 Critical Considerations for Probing OO g Tektronix Pa 1 iven by technology The Ideal Probe Absolute Signal Fidelity affect on the original signal No signal source loading Zero Input Capacitance Infinite Input Resistance Absolute Signal Fidelity Unlimited bandwidth zero to infinity Unlimited rise time instant 0 s Zero attenuation one to one Linear phase across all frequencies convenient and easy way to connect to the device under test Mechanically well suited to application 15 Critical Considerations for Probing OQ p Tektronix iven by technology The System Scope and Probe easy formula to calculate Measurement System specifications Tektronix provides specifications for scope amp probe combinations For best results use the probes recommended for your scope 16 Critical Considerations for Probing Tektronix driven technology 2 Physical Part Pull up resistors V sis SDA W sol Critical Considerations for Probing
18. le T I r system r signal 5 Measured rise time depends on the signal and scope rise times T T signa T 2 r Measured r signal r adi m 7 Actual 0 5 6 32 Critical Considerations for Probing Low Capacitance Passive Voltage Probing Comparison of different probes and compensation capabilities Reference Step Signal 240 2ps 254 4 Tektronix 1000 646 5ps 252 0mV Ve ry d nt j m 1 931ns 284 0mV 2 006ns 246 4mV results None J topped 12 292 acqs RL 1 0k RI 40 0mV 2 5ns 40 0mV 2 5ns Source of error 40 0mV div 2 5ns div 10 0GS s IT 25 0ps pt Auto November 18 2010 14 36 04 Critical Considerations for Probing Tektronix diven by technolagy Probing Tips and Tricks Probe Adapters will Affect the Measurement Ease of connectivity and signal fidelity are a trade off Accessories may impact rise time and cause aberrations Source Through 50 Ohm Terminator 1 MOhm CH 1 TDP1000 Square Pin LE LEM li mi COM 8371 TET LEE Hitap 01 igen Leen ide Bo POG a un IP n 34 Critical Considerations for Probing Q Q Tektronix dg driven by technology lt Probe Accessories The Connecti
19. namic Range High Input R Disadvantages High Input C Inductance of long ground lead 6 Critical Considerations for Probing Tektronix P2220 Probe 1 10X 200 MHz driven by technology rood Tektronix Active Voltage Probe Uses active components Advantages Low Input C Wide Bandwidth High Input R Better Signal Fidelity Tektronix TAP1500 Disadvantages Active Voltage Probe Higher Cost 10X 1 5 GHz Limited Dynamic Range Mechanically Less Rugged Lead 7 Critical Considerations for Probing OOO Tektronix eS driven by technology Differential Active Voltage Probes 8 Differential Probes measure signals that are referenced to each other instead of earth ground Advantages Wide bandwidth Large Common Mode Rejection Ratio CMRH Minimal skew between inputs Small input capacitance Scope Channel Amplifier Scope Critical Considerations for Probing Tektronix TDP0500 and TDP1000 Differential Probe 500 MHz or 1 GHz 42V Tektronix driven by technology Current Probes Measures the electromagnetic flux field around a conductor to determine the current flow wo Major Types AC current probes passive AD DC current probes active Features to Consider Automatic scaling and units Split core vs fixed core connection
20. on to the DUT 35 Connects the Probe to the DUT Adjustment tools Marker bands 9 digit part numbers are found on the web or in the User Manual Probe Tip Adapters Ground Leads Short and Long Attachment Klips Square Pin Adapters solder Down Adapters Critical Considerations for Probing driven by technology Example Probe Loading Active Differential Probe 7 lt gt 2 Showing Various Adapter e g Square Pin Adapter Critical Considerations for Probing Tektronix driven by technology Reference Signal vs Probe Output 5 9 lt Tek x mm Hef1 Position 7 probe loading B SMA output Blue Probe output White stored Reference Signal Critical Considerations for Probing Tektronix n Effect of Square Pin Adapter Critical Considerations for Probing Tektronix driven by technology Reference Signal vs Probe Square Pin Adapter Pins File Edit Vertical Honz amp cq Display Cursors Measure Les Tek Run ug WI 16 90 34 Buttons 2 i lt i Hef i Position T di Scale Om IRisefh1i 2050 Green probe loading SMA output Blue Probe output White stored Reference Signal M 2008
21. onix RS P 25 Critical Considerations for Probing driven by technology Source Loading Input Resistance acts like a voltage divider Higher input resistance less loading Lower source resistance less loading Probe Probe DUT 1 R source E source Lead 90 _ 100 pe 0 r t f Source Signal 26 Critical Considerations for Probing NM 22 2 x v In x uu w FT I I TIT 0 p E LLL d et tT Effects of Input Resistance _ rood driven by technology Tektronix ing increases d load _ Increases D humi lt D
22. ons for Probing Tektronix Digital Bus Analysis with Logic Probes IE HR HE I Th Dee m Specification DPO4000B MSO5000 500MS s 16 5GS s with MagniVu u hat 2351 500 MHZ VAE lt 42 Vpeak 30 Vp p x200MHz 10 Vp p 200 MHz 1001077021016 100 kOhm pF 40 V 400 mVp p 1 NS Maximum Sample Rate Maximum Input Voltage Swing DC L i Bimpe 8 marpa LIBET ali Time Rus color coded waveform display bus decode Critical Considerations for Probing roog Tektronix S What do the probing and acquisition architectures look like Passive probe A Digital input circuit logic analyzer ASIC acquisition circuit 0 2pF front panel connector Acquisition System Passive probe B Digital input circuit discrete design acquisition circuit 6pF Twisted pair front panel 3000 90 9kQ cable connector X X X X gt Acquisition Critical Considerations for Probing Tektronix Logic Probe Specifications for iCapture P6780 Differential Probe P6750 D Max Probe P6717A General Purpose Probe Analog Bandwidth Input Impedance 40 kO 2 0 20 kO 1 096 3 pF differential mode 0 5 Input Voltage 2V to 4 5V 1 5V to 4V Range Critical Conside
23. poser with Chip Interposer on DDR and CLK Module Critical Considerations for Probing 68 Tektronix Summary Probes are a critical element of your measurement system maximize measurement accuracy carefully choose your probe Type of signal Bandwidth Rise time Impedance Tektronix offers a wide range of probes and accessories to meet your needs 69 Critical Considerations for Probing driven by technology Tektronix Tektronix Probe Selector Visit www tektronix com probes 70 Critical Considerations for Probing Teel d Ekmusssa TRER T Da HE TEH es L SL ee Pe pC eee pih ee Hle Cherche IP RC Tg Tektronix Probes Advisor ka AAD WL bae cimo Sb ee lg ee ee 3 ee ee rere fhe dam 80 Gites Be LE nein e Ei hii Erei prex 12 bins Eo Hres 14 ree Erates Eli ung Mond sn iapa aafia Dan a 43477 mug Pie Ekz LT LJ Tama Lj La Parte Piri Li 4 ee 3e dmm cen Qi hear ie Dj 01 ne i appicatis esged 3
24. rations for Probing Tektronix P6780 Probe Access to lightly Spaced Test Points Industry s only differential active probes for MSOs Excellent signal fidelity Industry s best versatility in access points Device Leads oolder in VIA s and races BGA packages oquare Pins Reduces fixturing costs and development time Critical Considerations for Probing P6 80 Probe and Accessories UA oe gt Critical Considerations for Probing ektronix as driven by technology High Bandwidth Solder In Probing Solutions TriMode Micro Coax Tip Socket Cable ps 020 2954 xx ODD Mc P75TRLST Solder Tip up to 20GHz P7500 Series Tri Mode Probes Critical Considerations for Probing Tektronix dt technology Accessories Flexible Solutions New tips solder to small vias eS USE wo Le MEG Dm ST EE 1 A Critical Considerations for Probing IeKITOnIX driven by technolog Selection on Oscilloscope Screen for the used Adapter I Probe Tip Selection Long Reach Solder Tip PY5TLRST Up to 20 GHz TriMade Micro coax Tip 12 1 2055 xx Up to 4 GHz Resistor Solder EX Resistor Solder 020 2936 020 2944 xx Upto 18 GHz Upto GH Other Tip no DSP P
25. uation Probe Status Deskew Time External Atten T TCPO030 016 w Properties Clear ProbeCal External Atten dB Reset 0 0dB was Probe Deskew using ipe to od Test Fixture 454 3 Current Probe Degauss AutoZero gt x Auto BA _ Manual Bandwidth Controls 120 0 MHz M VAG driven by technology Choosing a Probe Critical Considerations for Probing OOO Tektronix _ driven by technology Choosing The Right Probe 46 Carefully Consider Your Application Type of signal voltage current single ended differential Signal frequency content bandwidth issue Signal rise time Source impedance R and C oignal amplitudes maximum and minimum Test point geometries Choose a probe specified for your scope Critical Considerations for Probing TekVPI Tektronix Versatile Probe Interface LT 0 Probe Setup Smart communication between oscilloscope and probe Automatic units displayed Nominal deskew of signal paths Probe menu on oscilloscope interacts directly with probe Provides more power to probes Enables greater flexibility in probe combinations Enables direct connection to current probes including ac dc differential probes and single ended active probes without external amplifiers 47
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