EMC COMPLIANCE TEST REPORT
Contents
1. Mains cables telephone lines or other connections to auxiliary equipment located outside the test are shall drape to the floor be fitted with ferrite clamps or ferrite tubes placed on the floor at the point where the cable reaches the floor and then routed to the place where they leave the turntable No extension cords shall be used to mains receptacle The antenna was placed at 10 meter away from the EUT as stated in EN 55022 The antenna connected to the Spectrum Analyzer via a cable and at times a pre amplifier would be used The analyzer receiver scanned from 30MHz to 1000MHz The EUT test program was started Emissions were scanned under battery charging mode and measured rotating the EUT to 360 degrees and positioning the antenna 1 to 4 meters above the ground plane in both vertical and horizontal polarization to maximize the emission reading level The test mode s described in Item 2 1 6 were scanned during the preliminary test After the preliminary scan we found the test mode described in Item 2 1 7 producing the highest emission level The EUT and cable configuration antenna position polarization and turntable position of the above highest emission level were recorded for the final test FCC Part 15 measurements below 1 GHz were performed at an EUT to antenna distance of 10 meters Measurements taken above 1GHz were taken at an EUT to antenna distance of 3 meters CISPR 22 measurements were performed at an EUT to antenn2. 0ceceeeeeeeeeeeees 23 3 2 Electromagnetic Immunity Report cceceeeee cece ee ea ee eaeseseeee ease ee eaeaeaeaeas 24 3 2 1 Electrostatic Discharge ESD Immunity Test eceeee ects ee ee eee eee es 24 3 2 2 Radiated Electromagnetic Field Immunity Test eceeeeeee sees neers 25 3 2 3 Fast Transient Burst Immunity Test vc ciccccsee vce ttdicectoacnrecssecwtsexsqasseeciiarses 26 3 2 4 Surge Immunity Test exe ccaneteactordeetwaciobdncnntonudensenabdiduecebereaainerelivzeusbed 27 3 2 5 Conducted Disturbance Induced Radio Frequency Field Immunity Test 28 3 2 6 Power Frequency Magnetic Field Immunity Test sssseseeeeeeeeeeees 29 3 2 7 Voltage Dips Short Interruptions and Interruptions Test 00068 30 Section 4 Test Arrangement Photos 4 1 Conducted EMISSIONS ssissvaccassavians vncarxadrarsmmindid emanate eiaelaceuiieuaaxaaaanee 31 4 2 Radiated Emissions sawavs ccscncieven aster devas etuaste ats occu dae ebbenddenevad eemcuerunwes 32 Page 3 of 32 C Quanta Computer Inc Report No 20070712 1 Approved By Applicant OLPC Manufacturer Quanta Computer Inc Product Laptop Brand Name OLPC Model Number XO 1 XO means any character or blank Test Date Jun 19 Jul 4 2007 COMPLIANCE STANDARDS FCC 47CFR Part 15 Subpart B Class B ANSI C63 4 2003 ICES 003 CISPR 22 1993 A1 1995 A2 1996 Class B CISPR 22 2006 CISPR 24 1997 A1 2001 A2
3. AF4 M4 PM402 CAEM Win Icd 2 Page 14 of 32 Adapter T2 RJ11 CA M2 M3 AF3 Serial No Calibrated Until V053100457 5 24 2008 N A N A 35737 N A N A N A N A N A N A N A N A N A 0705 01 N A 276 N A 0705 01 N A Quanta Computer Inc Report No 20070712 1 Capacitive D a coupio came EMTest HFK 4 EMTest CDN AF4 calibration kit EMTest CAA M2 M3 calibration kit EMTest 2 2 9 Power Frequency Magnetic Field Immunity Current Motorized EMTest MV 2616 8 V0523100453 EMTest EMTest Software 2 2 10 Voltage T and Short Interruptions Ai e e Tr M inuta Power Fail Page 15 of 32 C Quanta Computer Inc Report No 20070712 1 Section 3 Electromagnetic Emissions Test 3 1 Emission 3 1 1 Line Conducted Emissions Test Measurement Procedures Utilized for Conducted Emissions The EUT was set up as per the test configuration to simulate typical usage per the user s manual When the EUT is a tabletop system a wooden table with a height of 0 8 meters is used and is placed on the ground plane as per EN 55022 Associated equipment if needed was placed as per EN 55022 All I O cables were positioned to simulate typical actual usage as per EN 55022 The test equipment EUT installed received AC power through a Line Impedance Stabilization Network LISN which supplied power source and was grounded to the ground plane All associated equipment received power from a secon
4. Measurement Uncertainty 2ei3a cetscecets cesar states cad aveeieeeshid av teencav tens 8 2 1 2 Lab Accreditation s0ic censctensne amaeideonicnaiwenicnaeeniadeadoeidewhiscameesieblemnsiecnts 9 2 1 3 Software to exercise EUT c ccc cecceeee eee ee cece ee ee ee ee ee ee ease een ea eeaea ed 9 2 14 Special ACOCSSONGS ioen aaeei a eE E EEA EEES 9 2 1 5 Equipment Modifications and Deviations cceceeeeeeeeeeeeeeeeeeeeeeeees 9 2 1 6 Test Configuration ay ectscauncececece dar eebehadeensviedewedetbuianieeedcmaeenedonttencduuades 10 Arrangement block diagram s csicocedavesseses reste emeeueneriebereiweersdated eudeenes 10 Associated equipment oaxccesgssassuedcesaxedes vesnevoesessupsabnencorserdendeusieerers 10 Pre test configuration soe cccctsncne ed aoceiuesnecveuiepesnachesnanueaseeteecaties 11 Worst case for final testing snvivcccscoreidoctenndeelnsicavecn etd uncandcwediteieemimuatd 11 2 1 7 Cable Description and Information ceceeeeee ee eee eect eect eee eeeeeeeeees 11 2 2 Measurement Equipment sacccarszeuescirdescesveesntar aes cxsuct coegaycuseiieiaaardeactevseauty 12 2 2 1 Conducted Emissions 1 sc ocnacesensmersaendnnaueereachupaamokeaniagdatiomdiausensimay enue 12 2 2 2 Radiated Emissions ctcsvcicaccsccucscstanee oxteechnecepavonumhaederuamecnasea pupeouedes 12 2 2 3 Power Harmonic Flickers ieeciciccnsccaes cca idonterehanwens So dbiasd Wbedeuedaeneendees 13 2 2 4 Electrostatic Discharge ESD Immu
5. 2002 AS NZS CISPR 22 2004 Class B V 3 2006 04 V 4 2006 04 CNS13438 GB9254 GB17625 1 ETSI EN 301 489 1 v1 6 1 2005 ETSI EN 301 489 17 v1 2 1 2002 EN 61000 3 2 2006 EN 61000 3 3 1995 A1 2001 A2 2006 EN 55024 1998 A1 2001 A2 2003 EN 61000 4 2 2001 EN 61000 4 3 2002 A1 2002 EN 61000 4 4 2004 EN 61000 4 5 2001 EN 61000 4 6 2003 A1 2004 EN 61000 4 8 2001 EN 61000 4 11 2004 EN 55022 1998 A1 2000 A2 2003 Class B EN 55022 2006 Class B Reviewed By fe Ae Je Vk ie Z GE 7 _ DUL Cue Herculus Hsu Page 4 of 32 Quanta Computer Inc Report No 20070712 1 Section 1 General Information 1 1 Introduction Laptop OLPC 4 Name XO 1 XO means any character or blank Housing Type si Type Plastic AC Power Adapter Delta Model ADP 17FBAA ssid 17FB AA onn o a AA BA ADP 17FB e o ADP ADP 17FBDA asi s s s sid DA Model Aa ALF TADSOS3ALF Bee ooo ALF Lite On Model PA 1150 et PA 1150 05Q3 sd 1150 me a aoao PA 1150 PA 1150 05Q4 sd AC Power Adapter Rating I P 100 240VAC O P 12Vdc 1250mA AC Power Core AC Power Core Type Non shielded AC 2 pin 1 8m Non shielded DC 1 8m with one ferrite core 256MB RAM Camera CM0316 OLPC01 Page 5 of 32 Q Quanta Computer Inc Report No 20070712 1 VRAM M12S16161A 7TG en vese EMGAGI65TS 7G IS42R16100C1 7TL Battery NTA2488 600000049 Wireless LAN US101 I O Port USBpt i
6. 3a Page 6 of 32 Quanta Computer Inc Report No 20070712 1 1 2 Test Procedure The EUT was tested using special test software called H patterns which exercises all external I O ports as well as the internal storage media by writing and reading if applicable a continuous stream of H characters A pattern of continuous stream scrolling black H on a white background was written to display To exercise the optical drive a CD was put into the optical drive and played through the internal audio while the EMC testing was being done The measurements were made while the system was exercised in this manner Page 7 of 32 C Quanta Computer Inc Report No 20070712 1 Section 2 Test Facility and Procedure 2 1 Test Facility Used for Emission Testing Conducted Emissions Facilities Conducted Emissions were performed at QOMC Compliance Center of No 68 Sanzhuang Road Songjiang Export Processing Zone Shanghai P R China FCC Registration No 602285 VCCI Registration No C 2529 Radiated Emissions Facilities Radiated Emissions measurements were performed at QSMC Compliance Center of No 68 Sanzhuang Road Songjiang Export Processing Zone Shanghai P R China FCC Registration No 602285 VCCI Registration No R 2319 2 1 1 Measurement Uncertainty The measurement uncertainty has been determined to be the following Conducted Emissions 3 2 dB Radiated Emissions 3 6 dB The equipment conforms to the require
7. 8 45 Note Conducted Emissions data was also taken at 100 110VAC 60Hz This data was found to be equivalent or lower than the data listed above Page 17 of 32 Quanta Computer Inc Report No 20070712 1 230 VAC 50 Hz Mains Live Line Correction Reading Emission Limit Margins w or av or av or z EEA 0 24599 10 91 37 51 28 88 48 42 39 79 61 89 51 89 0 49398 10 53 29 57 17 17 40 10 27 70 56 10 46 10 Neutral Line Correction Reading Emission Limit Margins set ee en E Za Ea Ea Ea Ea EA EA 0 72196 10 47 19 90 30 37 17 81 56 00 46 00 25 63 28 19 Note Conducted Emissions data was also taken at 220VAC 240VAC 50Hz This data was found to be equivalent or lower than the data listed above Page 18 of 32 C Quanta Computer Inc Report No 20070712 1 3 1 2 Radiated Emissions Test Measurement Procedures Utilized for Radiated Emissions The equipment was set up as per the test configuration to simulate typical usage per the user s manual When the EUT is a tabletop system a wooden turntable with a height of 0 8 meters is used which is placed on the ground plane Associated equipment if needed was placed as per EN 55022 All I O cables were positioned to simulate typical usage as per EN 55022 The EUT received AC power source from the outlet socket under the turntable All associated equipment received power from another socket under the turntable
8. C Quanta Computer Inc Report No 20070712 1 EMC COMPLIANCE TEST REPORT REPORT NO 20070712 1 PRODUCT Laptop BRAND NAME OLPC MODEL NO XO 1 XO means any character or blank ISSUED DATE Jul 12 2007 ISSUED BY QSMC Compliance Center LAB ADDRESS No 68 Sanzhuang Road Songjiang Export Processing Zone Shanghai P R China COMPLIANCE STANDARDS FCC 47CFR Part 15 Subpart B Class B ANSI C63 4 2003 ICES 003 CISPR 22 1993 A1 1995 A2 1996 Class B CISPR 22 2006 CISPR 24 1997 A1 2001 A2 2002 AS NZS CISPR 22 2004 Class B V 3 2006 04 V 4 2006 04 CNS13438 GB9254 GB17625 1 ETSI EN 301 489 1 v1 6 1 2005 ETSI EN 301 489 17 v1 2 1 2002 EN 61000 3 2 2006 EN 61000 3 3 1995 A1 2001 A2 2006 EN 55024 1998 A1 2001 A2 2003 EN 61000 4 2 2001 EN 61000 4 3 2002 A1 2002 EN 61000 4 4 2004 EN 61000 4 5 2001 EN 61000 4 6 2003 A1 2004 EN 61000 4 8 2001 EN 61000 4 11 2004 EN 55022 1998 A1 2000 A2 2003 Class B EN 55022 2006 Class B Page 1 of 32 C Quanta Computer Inc Report No 20070712 1 Section 1 General Information 1 1 Introduction 20 c cece cece cece cece cece eeeeeeeeeeennnaennaaeeeeeenenneaeeeetttenuetesetetnnns 5 1 2 Test ProC dure cece cccc ccc ceccccccceeecneeceeeeeennuaaeeeeeeeaeeeeennaaeeneeetnnnnnaanaeenenas 7 Section 2 Test Facility And Procedure 2 1 Test Facility used for Emission Testing c cceceeeeee cece ee eeeeeeeaeaeaeeseeaeaes 8 2 1 1
9. GHz to 5 harmonics Mast Turn rene rasor renano enisn ut peran a 1321 67 AV 67 1321 67 AV 27 74 74 22 07 27 5 47 5 47 54 00 00 48 53 1571 33 AV 28 17 23 64 54 00 49 47 se Horizontal Polarization above 1GHz to 5 harmonics z a Mast Turn Freguoney racio renano misson tamt oran Ala Ta we oom es omom amom f a on ee 1320 99 AV 99 AV 27 74 74 24 74 74 300 00 54 00 00 51 00 Ea 89 AV cm 17 Ea 58 E 00 49 41 ENTS sean z00e zeae os sao fara 100 200 Note Radiated Emissions data was also taken at 100VAC 110VAC 120VAC 60Hz 220VAC 240VAC 50Hz This data was found to be equivalent or lower than the data listed above Page 22 of 32 Quanta Computer Inc Report No 20070712 1 3 1 3 Power Harmonics Measurement The product with power less than 75 Watt was met the requirements specified in EN61000 3 2 2006 No test is required 3 1 4 Power Voltage Fluctuation Flicker Measurement The product was tested and met the requirements specified in EN61000 3 3 1995 A1 2001 A2 2006 Test Condition Test Results Ps means short term flicker Pst 0 028 1 00 Pass Aa Pi means long term flicker Pr 0 028 0 65 Pass naair 5 de means relative steady state de 0 005 3 30 Pass Veliage change o dmax means maximum relative dmax 0 076 4 00 Pass voltage change Tat means maximum time that di d S 0 000 0 50 Pass exce
10. a distance of 10 meters Radiated Emissions Test Data Radiated Emissions measurements were performed at QSMC Compliance Center The data lists the worst case emission frequencies measured levels antenna cable and amplifier corrections the corrected field strength and the limit The data was collected at 10 meters and compared to the CISPR 22 Class B limits Test date 07 03 2007 Temperature 18 C Rel Humidity 60 Page 19 of 32 Quanta Computer Inc Report No 20070712 1 120 VAC 60 Hz Mains Vertical Polarization a Turn Cee dB uV dB uV m dB uV m 257 74 QP 13 73 10 50 24 23 37 00 12 77 Horizontal Polarization e Turn E 25770 iaeo 1395 2858 3700 Or manam ae om aos oroo am om 20 Note Radiated Emissions data was also taken at 100VAC 110VAC 60Hz This data was found to be equivalent or lower than the data listed above Page 20 of 32 Quanta Computer Inc Report No 20070712 1 230 VAC 50 Hz Mains Vertical Polarization Turn eee enn ome oe dB uV dB uV m dB yV m a494 ar i246 1125 2371 3000 Horizontal Polarization a ee ee Tanie dB uV dB uV m dB uV m Note Radiated Emissions data was also taken at 220VAC 240VAC 50Hz This data was found to be equivalent or lower than the data listed above Page 21 of 32 Quanta Computer Inc Report No 20070712 1 230 VAC 50 Hz Mains Vertical Polarization above 1
11. d LISN For conducted emission test on telecommunication ports a telecommunication port is connected by its signal cable to an impedance stabilization network ISN During the testing the LAN utilization is in excess of 10 and sustain that level for a minimum of 250 ms The traffic rate is monitored by the program of NetSpeed The EUT test program was started Emissions were measured on each current carrying line of the EUT using an EMI Test Receiver connected to the LISN powering the EUT The Receiver scanned from 150K Hz to 30MHz for emissions in each of the test modes During the above scans under battery charging mode the emissions were maximized by cable manipulation The EUT configuration and cable configuration of the above highest emission level were recorded for reference of the final test Conducted Emissions Test Data The following data was collected with a spectrum analyzer in peak detection mode unless otherwise noted Test date 06 19 2007 Temperature 17 C Rel Humidity 55 Page 16 of 32 Quanta Computer Inc Report No 20070712 1 120 VAC 60 Hz Mains Live Line Correction Reading Emission Margins me op ay AV Por x or Neutral Line Correction Reading Emission Limit Margins dB uV dB nV dB nV w or av or av om a 0 19400 11 13 36 55 26 70 47 68 37 83 63 86 53 86 16 18 16 03 0 37399 10 61 30 24 19 35 40 85 29 96 58 41 48 41 17 56 1
12. eds 3 3 Page 23 of 32 Quanta Computer Inc Report No 20070712 1 3 2 Electromagnetic Immunity Report EN55024 1998 A1 2001 A2 2003 3 2 1 Electrostatic Discharge ESD Immunity Measurement The product was tested and met the requirements specified in EN 61000 4 2 2001 Test Condition Test Results Amount of Performance Result Indirect Discharge A madi eRe e rass Indirect aa Indirect oa Page 24 of 32 Quanta Computer Inc Report No 20070712 1 3 2 2 Radiated Electromagnetic Field Immunity Test The product was tested and met the requirements specified in EN 61000 4 3 2002 A1 2002 Test Condition Equipment Testec Notebook Test Software H patterns Test Standard EN 61000 4 3 Test Results Test level 3V m Steps 1 of fundamental Dwell Time 3 sec Page 25 of 32 Quanta Computer Inc Report No 20070712 1 3 2 3 Fast Transient Burst Immunity Test The product was tested and met the requirements specified in EN 61000 4 4 2004 Test Condition mt y P q d NOTE L aa a ST pig sagt H patterns Test Standard EN 61000 4 4 Test Results fev oe s ass oon w ore e Page 26 of 32 Quanta Computer Inc Report No 20070712 1 3 2 4 Surge Immunity Test The product was tested and met the requirements specified in EN 61000 4 5 2001 Test Condition Test Software H patterns Test Standard EN 61000 4 5 Test Results Page 27 of 32 Quanta Computer I
13. hile the EMC testing was being done The measurements were made while the system was exercised in this manner 2 1 4 Special Accessories There were no special accessories used during these tests 2 1 5 Equipment Modifications and Deviations There is no EUT modification or test standard deviation Page 9 of 32 Quanta Computer Inc Report No 20070712 1 2 1 6 Test Configuration The EUT was configured as a worst case system configuration as a result from pre testing as described below 5 Arrangement Block Diagram Adapter Headphone amp Microphone 4 Associated Equipments P escrption Philips headphone mic SBC HM450 SD card Transcend 1GB Page 10 of 32 Quanta Computer Inc Report No 20070712 1 Pre test configuration Prior to taking the formal emissions data collected in this report many hours of pre testing have been performed The selection of the worst case system documented in this report was based upon this pre testing Mode CPU LCD Panel_ Memory Camera WLAN NAND Flash VRAM Battery Adapter LX700 LSO75AT011 06P052 US101 NTA2488_ PA 1150 05Q1 a R a a A seit awe SRST eT oe et lan a lee lige cat eee ele len ae ae Worse Case for Final Testing mode 11 chosen 2 1 7 Cable Description and Information Cable Type Shiekied Femte USB cable Multimedia Headset Page 11 of 32 C Quanta Computer Inc 2 2 Measurement Equipment Repo
14. ment of CISPR 16 1 CISPR 16 4 2 ANSI C63 2 and other required standards Calibration of all test and measurement including any accessories that may effect such calibration is checked frequently to ensure the accuracy Adjustments are made and correction factors are applied in accordance with the instructions contained in the respective manual Page 8 of 32 C Quanta Computer Inc Report No 20070712 1 2 1 2 Lab Accreditations Scope of Accreditation 3 10 meter chamber and FC conducted test chamber to USA FCC perform FCC Part 15 18 measurements 602285 3 10 meter chamber and VEI Japan VCCI conducted test chamber to perform radiated conducted R 2320 2319 measurements C 2529 FCC 47CFR Part 15 Oy CISPR22 AS NZS CISPR 22 87 V 3 2006 04 V 4 2006 04 CNS13438 GB9254 gra ISO IEC aT IGS TE Neues CaaS CNAS 2804 TOE CNAS EN61000 3 2 EN 61000 3 3 CISPR24 EN55024 EN61000 4 2 EN61000 4 3 EN61000 4 4 EN61000 4 5 EN61000 4 6 EN61000 4 8 EN61000 4 11 2 1 3 Software to Exercise EUT The EUT was tested using special test software called H patterns which exercises all external I O ports as well as the internal storage media by writing and reading if applicable a continuous stream of H characters A pattern of continuous stream scrolling black H on a white background was written to display To exercise the optical drive a disk was put into the drive tray and played through the internal audio w
15. nc Report No 20070712 1 3 2 5 Conducted Disturbance Induced Radio Frequency Field The product was tested and met the requirements specified in EN 61000 4 6 2003 A1 2004 Test Condition Equipment Testec Notebook Test Results Frequency Step 1 of fundamental Dwell Time 3 sec Page 28 of 32 Quanta Computer Inc Report No 20070712 1 3 2 6 Power Frequency Magnetic Field Immunity Test The product was tested and met the requirements specified in EN 61000 4 8 2001 Test Condition Test Results Power Freq 50Hz Orientation Field Performance Criteria Result Pass Fail Page 29 of 32 Quanta Computer Inc Report No 20070712 1 3 2 7 Voltage Dips Short Interruptions and Interruptions Test The product was tested and met the requirements specified in EN 61000 4 1 1 2004 Test Condition Equipment Teste Notebool Test Software H patterns Test Standard EN 61000 4 11 Test Results The duration with a sequence of three dips interruptions with interval of 10 s minimum Between each test event Voltage Dips Page 30 of 32 SECTION 4 Test Arrangement Photos 4 1 Conducted Emissions Page 31 of 32 Q Quanta Computer Inc Report No 20070712 1 4 2 Radiated Emissions Page 32 of 32
16. nity c cece eee eee eeee eter eeeees 13 2 2 5 Radiated Electromagnetic Field Immunity c eeeeeeeeeeeee eee eee 13 2 2 6 Fast Transient Burst Immunity siicieiecdesvseccewrcencceaterutetbeenetedenbovedaesnanes 14 2 2 7 Surge IMmunity arste honest te rteceatiesdinetiatatond Suiidadeacartehleiaentesoumcmantoaeders 14 2 2 8 Conducted Disturbance Induced Radio Frequency Field Immunity 14 2 2 9 Power Frequency Magnetic Field Immunity cceceeeeeee eset eee eee 15 2 2 10 Voltage Dips Short Interruptions and Interruptions sessessesseeneereen 15 Page 2 of 32 C Quanta Computer Inc Report No 20070712 1 Section 3 Electromagnetic Emissions Test S EMISSION sae sa cgpcaniccn E cen Giga E 4 Qian T 16 3 1 1 Line Conducted Emissions Test cccceceeeececeeeeeeeeeeeeeeeeeseaeaeaeeees 16 Measurement Procedures Utilized for Conducted Emissions 16 Conducted Emissions Test Data c cece cece cece eee eee eeeeeeeeeeees 16 3 1 2 Radiated Emissions Test s acucccetimetaneaciscmterasnedenluasanreeamuaueniodeuntes 19 Measurement Procedures Utilized for Radiated Emissions 19 Radiated Emissions Test Data cccccseeeeeee cette eee eeeeneenens 19 3 1 3 Power Harmonics Measurement ccccccceeeeceeeeeeeeaeeeeeeaeeeeeeaeeeenes 23 3 1 4 Power Voltage Fluctuation Flicker Measurement
17. rt No 20070712 1 N A is an abbreviation for Not Applicable All equipments are traceable to CNAS calibration standards 2 2 1 Conducted Emissions Description Test Receiver LISN LISN TLISN TLISN Software Manufacturer Rohde amp Schwarz Schwarzbeck Schwarzbeck 2 2 2 Radiated Emissions Description Test Receiver Test Receiver Bilog Antenna Bilog Antenna Preamplifier Preamplifier Preamplifier Software Antenna Mast Antenna Mast Turn Table Controller Manufacturer Rohde amp Schwarz Rohde amp Schwarz Schwarzbeck Schwarzbeck Agilent Agilent Agilent ADT Innco Innco Innco Innco Model No ESC1 NSLK8127 NSLK8128 FCC TLISN T2 FCC TLISN T4 ADT_Cond_V7 3 4 Model No ESCI ESIB26 VULB9168 VULB9168 8447D 8447D 8449B ADT_Radiated_V7 MA4000 MA4000 DT3000 1T C MA4000 104 9 A CO2000 Page 12 of 32 Serial No 100167 8127433 8128229 Serial No 9168 198 9168 195 294410848 294410847 3008A02145 N A MA4000 101 9 770405 L DT3000 1T C 2 2 C02000 218 9 N 770405 L Quanta Computer Inc Report No 20070712 1 2 2 3 Power Harmonics and Voltage Fluctuation Flicker Manufacturer Model No Serial No Calibrated Until ACS 500 V0523100459 5 24 2008 Source Harmonics amp EMTest DPA 500 5 24 2008 Flicker Analyzer 2 2 4 Electrostatic Discharge ESD Immunity Description Model No Serial No Calibrated Un
18. til ESD Simulator EMTest ESD 30C V0523100460 6 1 2008 ESD Simulator ESS 2002 ESS0423758 5 30 2008 ESD Simulator Keytek MZ 15 EC 0506331 5 30 2008 2 2 5 Radiated Electromagnetic Field Immunity Description Serial No Calibrated Until A iA JA Accessories Amplifier Research DC7144A 311989 Controller Amplifier Research SC1000M1 312477 igna Rohde amp Schwarz SMLO3 102270 5 24 2008 Generator Page 13 of 32 C Quanta Computer Inc we 2 2 6 Fast Transient Burst Immunity Description EFT Generator CA EFT kit EMTest Manufacturer EMTest EMTest Software 2 2 7 Surge Immunity Description Telecom surge generator Impulse Generator Manufacturer EMTest EMTest Model No EFT500 Model No TSS 500 M10 VCS 500 M10 KW50 KW1000 EMTest Software Report No 20070712 1 Serial No Calibrated Until V0523100450 5 24 2008 Serial No Calibrated Until V0523100456 5 24 2008 V0523100451 5 24 2008 2 2 8 Conducted Disturbance Induced Radio Frequency Field Immunity Continuous Wave Simulator EM Clamp kit Built in power monitor calibration kit Operation system for CWS500C Manufacturer EMTest EMTest EMTest EMTest EMTest EMTest EMTest EMTest EMTest EMTest EMTest EMTest EMTest EMTest EMTest Model No CWS 500C ATT 6 75 CDN M2 M3 CDN T2 CDN T4 CDN T8 RJ45 EM Clamp CWS CAL CA T2 AF2 CA T4
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