SunLite® E1
Contents
1. and gt 2 Select the Rx TS the timeslot you want to receive and take measurements on using and gt 3 Select one of the following TONE Inserts a tone on the selected Tx timeslot e TALK Inserts your voice on the transmit signal via the test set s microphone e QUIET Place a quiet termination on the transmit signal a highly attenuated low frequency signal 4 Setthe Tx FQ frequency in Hz LVL level in dB Press to change each number and cursor to each digit Press GF to view the screen shown in Figure 55 48 SunLite E1 Tx ABCO BBB6 Rx ABCO 40B488 Rx LUL 86 6 dBm Rx FREO 1828 Hz y Figure 55 VF Screen 2 5 You may change the transmitted signalling ABCD bits at the first line Press to select 1 or 0 for each position Note ABCD bits transmission requires PCM 30 or PCM 30C framing 6 Observe the VF measurements Rx ABCD Received Channel Associated Signalling System CAS its They are mean ingful only with valid PCM 30 framing e Rx LVL Received level in dBm e Rx FREQ Received frequency in Hz Press GF to view the screen shown in Figure 56 PEAK 168 PEAK 127 OFFSET 65 CH DATA 11111111 y Figure 56 VF Screen 3 e PEAK Binary value of the codes that will produce the maximum decoder output level e PEAK Binary value of the codes that will produce the minimum decoder output level e OFFSET Binary value of the difference between the code that2. MAN 10100 001 Rev COO SUNRISE TELECOM INCORPORATED Sunlite 1 User s Manual SS265 Sunrise Telecom a step ahead y X _ gt E _ o OOU 302 Enzo Drive San Jose CA 95138 Tel 1 408 363 8000 Fax 1 408 363 8313 ZN WARNING Using the supplied equipment in a man ner not specified by Sunrise Telecom may impair the protection provided by the equipment Copyright 2004 Sunrise Telecom Incorporated This device uses software either developed by Sunrise or licensed by Sunrise from third par ties The software is confidential and proprie tary The software is protected by copyright and contains trade secrets of Sunrise or Sunrise s licensors The purchaser of this device agrees that it has received a license solely to use the software as embedded in the device and the purchaser is prohibited from copying reverse engineering decompiling or disassembling the software 2 SunLite E1 SunLite E1 User s Manual Table of Contents 1 General Description seeeeeee 5 11 LED Panel isc isis 6 132 Keys oda 8 1 3 Connectors Controls and Back Side 10 1 4 Battenes iia 12 2 Basic Definitions cconnncnnnnnnnnnncnnss 13 3 Menus ccccncoccconcncnannanonannncnonano nana ne nanancnas 14 4 Menu Parameters ccccsseeesseeessens 15 4 1 Configuration Key 15 4 2 Test Pattern KeY oocococ o 20 4 3 O Transmit Key 0 0 22 4 4 B Results Key cooooocconicccinconnccc
3. UAS RAS Press gt and G to page through the measurement results screens Summary Results ET 01 00 00 RT 00 55 32 ONLINE TESTING Figure 15 Summary Results Screen Overall summary OK no errors or alarms detected ET Elapsed Time since pressing gt This is reset to zero after pressing MI then gt RT If the test is timed this shows the Re maining Time of the test in Hours Minutes Seconds If the test is continuous it will display gt 23 Signal Frequency Results SIGNAL FREQUENC 2 LUL 2 9 db REC ppo adBaBB HIH ppo B008 y Figure 16 Signal Frequency Results Screen e LVL Negative and positive level of the pulses being received by the test set Mea surements are from the base of the pulse to its peak and are displayed in decibel variance from DSX level dB e REC ppm Received frequency variance from 2 048 MHz in parts per million For example if the received frequency is 2048010 24 Hz the test set will report 2048010 24 5 ppm Press gt gt to see in Hz e MIN ppm Minimum frequency variance value which has been measured in parts per million Press gt gt to see in Hz MAX Hz 2646688 CLESLP HA Figure 17 Frequency Results Screen e MAX HZ Maximum frequency measured since the beginning of the test This variance is shown in both Hz and ppm Scroll to the next screen to see the measurement in ppm NAS ppm 6 6 CLESLP HAHHAH Figure 1
4. profile will overwrite a previous profile PRINT Use to print a profile by At PROFILE select a USER profile Press w to select ACTION Press gt gt to select PRINT Press GD RECALL Activate a Stored Profile by At PROFILE select a USER profile Press w to select ACTION Press gt to select RECALL Press GD DELETE Remove a Stored Profile At PROFILE select a USER profile Press w to select ACTION Press gt gt to select DELETE Press WD e CURRENT Prints the current profile This is the only action available POON gt PON ROMs The next Function menu screen contains TEST DURATION 2 TEST RESULTS DELAY TIMER SEND FRAME WORDS y Figure 35 Function Menu Screen 2 TEST DURATION TEST DURATION PERIOD CONTINUOUS Figure 36 Test Duration Screen This screen contains the following 35 PERIOD Determine the measurement duration Options CONTINUOUS 15 MIN 1 HR 12 HRS 24 HRS PROG e CONTINUOUS Test will run until Mi is pressed e 15MIN 1 HR 12 HRS 24 HRS or PROG Select a timed period or choose a duration time by selecting PROG and then 1 Press w to select the DD HH MM line 2 Press to select a digit to use 3 Press or gt to move the cursor 4 Press D to return to the Function menu TEST RESULTS View print delete label or lock unlock mea surement test results Options RESULTS 1 through 10 ACTION VIEW PRINT DELETE NONE LO
5. set SW 1 SW 2 SW 4 and SW 5 to ON to the right 2 Plug in the charger and turn on the power 3 Run the program SUNLITEE1 EXE Go to VIEW and select SEND MSG 4 Click OK on all of the small windows You will see a final display of DOWNLOAD IS DONE HAVE A NICE DAY 5 When done turn off the test set and reset the DIP switch as shown in Figure 1 5 2 FLASH Memory Download 1 On the DIP switch DP1 inside the battery compartment set SW 1 and SW 3 to ON to the right Plug in the charger and turn on the power Select FLASH MEMORY and press QD Run the program SUNLITEE1DLG EXE Click OK until you see PROGRAMMING INPROGRESS You will be asked to Erase NV RAM press QD to complete 5 When done turn off the test set and reset the DIP switch as shown in Figure 1 5 3 DSP Download 1 On the DIP switch DP1 inside the battery compartment set SW1 and SW 3 to ON to the right Plug in the charger and turn on the power Select DSP and press QD Run the program When done turn off the test set and reset the DIP switch as shown in Figure 1 AON awh 53 Here is a list of a variety of the applications you can undertake with your test set Accom panying each listing is a graphic showing you how to plug in 6 1 Accept a New 2 048 Mbit s Circuit REFCLK RX Loopback Device Figure 62 Accepting a New Circuit 54 SunLite E1 6 2 Monitoring an In Service Circuit Bridgin
6. Indication Signal an all 1s signal on the line Indicates loss of signal or other severe problem HHH MM SS hours minutes seconds LT Line Termination LVL Level PMP Protected Monitoring Point RAI Remote Alarm Indication notice that an alarm has occurred at the far end of the line Ul Unit Interval This is the time it takes to transmit 1 bit 488 ms at 2 048 Mbit s mS Microsecond VF Voice Frequency The test set is key driven The following table shows the organization of the keys and their options To select a menu press it s corre sponding key If you get lost in a menu press the same key to start over Key Page Options or Screens 15 MODE 16 FRAME 19 INPUT 19 TxCLK 20 Test Patterns GO 22 MODE B 23 SUMMARY 24 SIGNAL FREQUENCY 25 ERRORS 28 SIGNAL ERRORS 28 FRAMING RAI 29 G 821 31 G 826 32 M 2100 550 CD 33 TIME amp DATE 33 SET IDLE CODES 34 PRINT PERIOD 34 PROFILE 35 TEST DURATION 36 TEST RESULTS 37 DELAY TIMER 38 SEND FRAME WORDS 39 M 2100 PARAMETERS 39 CLK CALIBRATION 40 AUDIBLE ALARM 40 ERROR INJECTION 41 LOOP CODES 42 ERASE NV RAM 43 COMPANDING 43 PROPAGATION DELAY 44 LINE CODING 44 FREQ RESOLUTION 45 AUTO STRESS 45 LANGUAGE SELECTION 45 LINE TERMINATION 46 ALARM GENERATION 46 G 821 ALLOCATION 47 VIEW RECEIVED DATA CD 48 VF Setup and Measurements 50 O
7. Screen 41 1 Decide whether to send a standard loop code or to enter your own pattern e Ifyou choose to senda STANDARD pattern you have two choices Loopback 1 is a complete transparent loopback located in the LT Loopback 2 is a complete transparent loopback located in the NT1 e f you choose PATTERN enter the code you want to send Choose the Sa bit from Sa4 to Sa8 Enterthe Up and Down loopback codes using gt gt to select between 1 and 0 2 The loopback codes will be sent when you press the appropriate key See Figure 47 for a sample screen TYPE STANDARD SA BIT SAG LOOP UP LOOPBACKL LOOP ON RELEASE Figure 47 Loopback Screen 3 Press to take the loop down After the loopback release is complete the Sa5 bit sent to the TE will be set to 1 ERASE NV RAM Use this function as a last resort if the test setis not functioning properly Initiate Erase NV RAM only after making sure the test set is configured properly Press G to start Note All user stored information will be erased 42 SunLite E1 COMPANDING Select the companding characteristic Options A law U law Technology Note Companding Characteristic An 8 bit code word is formed by comparing the amplitude of the analog sample to a companding characteristic The companding characteristic is a formula which translates the amplitudes of the 8000 Hz samples voice to digital into the 8 bit code words Internationally
8. as an AIS 1010 This is the alternating ones and zeros pattern The pattern is frame aligned with f showing the location of the framing bit The pattern is f 0101 0101 0000 This is the all zeros pattern If the circuit is AMI the pattern synch and or signal will be lost RICAR 3 Fixed 24 bit pattern used in France The pattern is 1000 1000 1000 1111 1111 1111 21 4 3 CG Transmit Key Determine the test set s transmitter status Options TX ON TX OFF SELF LOOP TRANSMITTER MODE T OH Figure 14 Transmitter Screen e TX ON Activates the transmitter e TX OFF Deactivates the transmitter e SELF LOOP Thetestset sends its transmit signal directly to its receiver in order to verify the test set is configured properly and is able to achieve pattern synchronization before connecting to the line 22 SunLite E1 4 4 El Results Key Press B to view test results There are a number of screens including counts and percentages Taking Measurements 1 2 3 Set up the configuration screen and press cH Press and the RUN LED will turn green During measurement CD Guid Gu GD ED and are deactivated Press ll to stop measurements The RUN LED will turn off Press B to see test results Many results are available in percentage formats as well as counts Press to ac cess these results For example the G 821 screen shows EF UAS andAS counts Press and the screen shows EFS
9. jo SOWELI GL 1S0 s uoneziuoIyou s svo BunyeuBis 104 suq 91 10 sau auesy syq BunpeuBis g SV J were e OWe SYIIN A O O g v SUIRIUOO 9181 94 JOISeWIL PT A o a XXAX SV IAN 8uBIs SYAN 119 8 91 Jose 0 ewes SunLite E1 s118 s118 Figure 11 MFAS Frame Structure sy waa gt gt gt e wei z wia y wia o wia 18 INPUT Select the receiver level Options TERM HI Z MONITOR TERM Terminates the line HI Z Configures the test set for high imped ance mode MONITOR Use when connecting the test set to a PMP TxCLK Select the transmit clock source Options INTERNAL EXTERNAL RECEIVED IN XXXXX ppm or Hz Note If the test set does not have the clock off set option this setting is fixed at INTERNAL INTERNAL Uses the test set s internal 2 048 MHz 25 ppm clock IN XXXXX Use to shift the internal trans mit frequency in ppm up to 24400 ppm or Hz up to 50000 Hz To do so Press gt to move the cursor to each digit position Use to select a digit from 0 to 5 for the first position and from 0 to 9 for the remainder Press any key to exit the screen EXTERNAL Use an external frequency source connected to the test set REF CLK input to provide timing for the transmitted E1 signal RECEIVED Recovers the clock from the re ceived signal and uses it as your TxCLK 4 2 Test Pattern Key Select or create a test pattern The pattern is trans
10. loop mode G Turn the backlight on off Gs Inject an error on the transmitted signal Gzo gt Press to clear blinking LEDs E Press the lock unlock key once to lock all keys The test set will beep once and its settings cannot be changed Press the key twice the keys will be unlocked and the test set will beep twice mo Access the function menu to set various parameters G4 Execute a specific action Co gt Turn the test set on off Note that if you quickly turn the test set on after turning it off you may see static for a moment It will clear and the normal start up screen will appear 1 3 Connectors Controls and Back Side This section describes the connectors and controls available on the test set Top Panel TX REFCLK RX oo A Figure 5 SunLite E1 Top Panel Z warnina The connectors on this panel are intended for connection to E1 circuits only as defined in EN60950 Maximum input voltage 12VDC e TX 75Q unbalanced BNC connector transmits the E1 signal from the test set e REF CLK BNC reference clock input con nector plug a 2 048 Mbit s AMI or HDB3 reference clock signal in here e RX 75Q unbalanced BNC connector re ceive the E1 signal here Right Side e Volume Control Adjusts speaker volume e Serial Port This RJ 11 serial port is used to connect a printer or download firmware Left Side e Contrast Control Adjusts screen contrast Bottom Side e 5VDC Plug the power adapt
11. to 60 days of histograms 1 day resolution and the last 24 hours with 1 minute resolution 2 HISTO GRAMS stored CURRENT and SAVED Propagation Delay measurements in Ul and us 1 us resolution Range from 100 us to 10 seconds Voice Frequency Capability Talk listen by using the built in microphone speaker Companding A law or p law selectable Monitor and CAS modes ABCD bits display for a selected timeslot CAS signaling monitoring IDLE NOT IDLE state Set ABCD bits to 1 or 0 of selected timeslot Set CAS state IDLE NOT IDLE Set Idle Channel code 65 Frame Word Settings Sa bits read write with all 40 bits independently settable Selectable loopback release commands Set Loop Up Loop Down Sa4 8 bit code or transmit pattern SLE 01 Clock Offset Option Transmitter Frequency programmable to 2 048 Mbit s 24 400 ppm 2 048 MHz Accuracy 2 ppm after external calibration Receiver Frequency range 2 048 Mbit s 24 400 ppm Other measurements Automatic stress automatically determines the receiving equipment s upper and lower frequency capture range SLE1 02 VF Measurement Option VF Measurement 50 to 3950 Hz 1 Hz Resolu tion 3 dBm0 to 60 dBm0 1 dB resolution Send Receive tone 50 to 3950 Hz res 1 Hz 3 to 60 dBm0 res 1 dB Noise S N psophometric 3K level measure ment 3 to 60 dBm0 Digital representation of sinusoidal signals in a selected timeslot A law and p law coding to ITU T G 711 Coder offse
12. 30 PCM 30C PCM 31 PCM 31C Unframed and test pattern Impedances Terminate Monitor 75Q unbalanced Hi Z gt 2000Q Return loss performance according to ITU T G 703 Jitter tolerance according to ITU T G 823 External Clock Interface Input Impedance 75Q Unbalanced Input Sensitivity 20 dB resistive loss com bined with 6 dB cable loss Line Coding HDB3 amp AMI Measurements E1 signal level 0 to 43 dB resolution 1 dB Frequency measurement Hz and ppm Se lectable frequency resolution 1 Hz 0 1 Hz and 0 01 Hz Current Max Min Clock slips count Code errors error count and ratio Frame errors FAS and CRC 4 errors count and error ratios Count of LOS Loss of Sync SYLS LOF AIS FAS RAI and MFAS RAI seconds Bit errors ITU T G 821 analysis with allocation programmable HRX ITU T G 826 measurements 64 SunLite E1 ITU T M 2100 measurements in conformance with M 2101 E bit errors error count and ratio Setup and test results printing Test Duration programmable Print interval programmable NOW 5 minute 15 minute 1 hour 24 hours LAST EVENT OFF Time stamped events printing Delay timer programmable up to 99 hours 59 minutes Audible alarm indicates an error or alarm programmable ON OFF Alarm Generation AIS FAS RAI MFAS RAI Other Measurements Save 10 test results available to screen view or print with user defined label Histograms G 821 basic measurements up
13. 49 VF Screen 4 50 CAS Screen 50 Histogram Menu Screen 51 Histogram Measurements 51 Sa bits Screen 52 Accept a New Circuit 54 Monitoring an In Service Circuit 55 Propagation Delay 56 Frequency Synchronization 57 Measuring Signal Level 58 Signal Frequency Screen 58 CAS Sample Screen 59 Voice Frequency Monitoring 59 Insert a Hitless Digital Tone 60 Fractional E1 Testing 61 75 fractional testing 15 Frame Words 38 Frequency Resolution 44 G G 821 Allocation 46 Threshold 46 General Description 5 H Histogram 51 l IDLE CODES SET 33 Internal Transmit Frequency 19 K Keys 8 0101 9 Backlight 9 CAS 9 50 CONFIG 9 Enter 9 ERR INJ 9 Histogram 9 HISTORY 9 Lock Unlock 9 Loop down 9 Loop up 9 OTHERS 9 Page down 9 Page up 9 Power 9 Print 9 RESULTS 23 Sa BITS 9 Tx 9 VF Measurements 9 76 SunLite E1 L Language Selection 45 LEDs AIS 7 BIT 6 CODE 6 CRC 4 6 ERROR 6 PCM 30 PCM 31 6 POWER 7 RAI 7 RUN 7 SIGNAL 6 SYNC 6 TX 7 Line Coding 44 Line Termination 45 Loop Codes 41 M M 2100 Parameters 39 Measurements Errors 25 Framing RAI 28 G 821 29 G 826 Results 31 M2100 550 Results 32 Signal Frequency Results 24 Signal Errors 28 taking 23 Menu Tree 14 P Print Peroid 34 Profile 34 Propagation Delay 43 R Receiver Level 19 Reference Clock 10 S SA Bits 41 Self Loop 22 Send Frame Words 38 Serial Port 10
14. 8 Frequency in ppm Screen 24 SunLite E1 e CLK SLP Number of clock slips since the beginning of the test A clock slip occurs when the measured frequency deviates from the reference frequency by one unit interval Note If there is no reference frequency CLK SLP is reported as N A Errors CODE ER 999999 FAS ERR 999999 CRO4 ER 999999 E BIT 999999 Figure 19 Error Screen e CODE ER Count of the number of code errors since the beginning of the test e FASERR Countof Frame Alignment Signal errors e CRC4 ER Count of the number of CRC 4 errored blocks since the beginning of the test This measurement is N A when the test set is not synchronized on a received CRC 4 multiframe e E BIT Count of the number of E bits which have been received since the beginning of the test Note Press gt gt to see the error rates as in Figure 20 CE RATE B Be 9 FE RATE 6 6e 6 CRCRATE 6 6e 6 EB RATE He 6 Figure 20 Error Rates Screen 25 Technology Note CRC 4 The equipment which originates the E1 data calculates the CRC 4 bits for one submulti frame lt inserts the CRC 4 bits in the next submultiframe The receiving equipment performs the reverse mathematical computa tion on the submultiframe It compares the transmitted and calculated values If there is a discrepancy in the two values a CRC 4 error is reported Each CRC 4 error does not necessarily correspond to a single bit error Multiple bit errors withi
15. CK UNLOCK Create or Edit a Results Label At the RESULTS line rename the label with a name up to eight characters long 1 Press D to move through the saved test results Atatest ofinterest press gt andthe cursor will move under the first character 2 Press w and 4 to move through the char acters at the RESULTS label line 3 When you have selected a character to use press to enter the character and move the cursor to the next character Leave a blank space by moving the cursor without choosing an entry Press while on a character to erase all characters to the right of it Clear the entire label by pressing gt with the cursor at the left of the label 36 SunLite E1 4 When done move the cursor to the left of the label and the label is stored TEST RESULTS ACTION Choices 1 Select the test results of interest 2 Press w to select the ACTION line 3 Press to choose an action then press QD to carry out the selected action e If DELETE is selected a warning message is displayed press GD to delete press any other key to escape and keep the test e Press after selecting ACTION PRINT to print the selected test results e A START MEASUREMENTS FIRST message is displayed if you attempt to print save view or delete records when no measurements have been made e The date and time of a result is displayed at the bottom of any saved results screen e Press to prevent changes press it aga
16. Errored Sec onds received since the beginning of the test An SES has an error rate of 10 or higher G21 3 6 EFS 106 UAS A AS 100 Figure 25 G 821 Results Screen 2 e EFS Count of Error Free Seconds since the beginning of the test e UAS Count of Unavailable Seconds since the beginning of the test This begins at the onset of 10 consecutive SES or at a loss of signal frame or pattern e AS Count of Available Seconds which is the length of the total test time minus any UAS Notes e The G 821 standard is set in Cr gt G 821 ALLOCATION 29 30 When the LIVE pattern is selected G 821 measurements will be reported as N A as in the following figure GAZi 2 63 BER He A ES He A SES H A Gazi 5 63 OH A YES PFP SES P F F Figure 27 G 821 DGRM Screen DGRM Count of Degraded Minutes a block in which there is a 10 bit error rate during 60 available non severely errored seconds Press D to see the results in a percentage format ES P F Reports PASS or FAIL for the G 821 ES standard SES P F Reports PASS or FAIL for the G 821 SES standard SunLite E1 G 826 Results COzb 1 4 EB A BBE A SES A Figure 28 G 826 Measurements Screen 1 e EB Count of Errored Blocks which contain bit errors e BBE Count of Background Block Errors A BBE is an EB not occurring during an SES e SES Count of Severely Errored block Seco
17. IET Ts FA LUL 16 8 90 y Figure 69 Voice Frequency Monitoring Screen 3 lf necessary change the transmit and receive timeslots 4 Set QUIET for INSERT 68 Send Receive Digital Tones Figure 70 Insert a Hitless Digital Tone 1 Connect the cords in the order indicated 2 Select TONE as the INSERT type in VF 60 SunLite E1 6 9 N or M x64 kbit s Testing INTERN Timing Figure 71 Fractional E1 Testing 7 Specifications Note This information is subject to change Connectors and Ports 2 048 Mbit s E1 interfaces Tx Rx Ext Clock Standard BNC f 75Q unbalanced connectors Optional BR2 f 120Q balanced connectors Bantam f 120Q balanced connectors Serial Port RS 232 v 24 RJ 11 6 pin connector Charger 1 mm DC jack Status Indicators LEDs 13 super bright LED indicators Current status and alarm history SIGNAL red no signal green signal flash red history PCM 30 bi color CRC 4 bi color SYNC bi color TX solid green transmitter activated flash green in self loop mode off transmitter de activated RUN green measurement running off mea surement stop RAI red MFAS RAI or FAS RAI flash red history AIS red AIS flash history CODE red code error flash history ERROR red CRC 4 E bit FAS E flash history BIT red logical bit error flash red history Power low battery slow flash green power on and battery fully charged solid green battery being charged r
18. Software Download Procedure 53 Specifications 62 System Profile 34 T Technology Notes Alarms 46 Companding Charactistic 43 CRC 4 27 Standard Loopbacks 41 Standard Test Patterns 21 Test Duration 35 Test Pattern 20 Test Results ACTION Choices 37 configure 36 Label 36 Time amp Date 33 Top Panel 10 Transmit Clock 19 U User Pattern Select or Create 20 V VF Measurements 49 VIEW RECEIV DATA 47 Ww Warnings 4 10 12 Warranty 68 78 SunLite E1 80 SunLite E1
19. THERE ARE NO OTHER WARRANTIES EXPRESS OR IMPLIED COMPANY SPECIFICALLY DISCLAIMS THE IMPLIED WARRANTIES OF MER CHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE COMPANY S LIABILITY UNDER THIS AGREEMENT WITH RESPECT TO A PRODUCT IN CLUDING COMPANY S LIABILITY FOR FAILURE AFTER REPEATED EFFORTS TO INSTALL EQUIPMENT IN GOOD WORKING ORDER OR TO REPAIR OR REPLACE EQUIPMENT SHALL IN NO EVENT EXCEEDTHE PURCHASE PRICE OR LICENSE FEE FOR THAT PRODUCT NOR SHALL COMPANY IN ANY EVENT BE LIABLE FOR ANY INCIDENTAL CON SEQUENTIAL INDIRECT OR SPECIAL DAMAGES OF ANY KIND OR NATURE WHATSOEVER ARISING FROM OR 69 70 RELATED TO THE SALE OF THE MER CHANDISE HEREUNDER INCLUDING BUT NOT LIMITED TO DAMAGES ARIS ING FROM OR RELATED TO LOSS OF BUSINESS LOSS OF PROFIT LOSS OF GOODWILL INJURY TO REPUTATION OVERHEAD DOWNTIME REPAIR OR REPLACEMENT OR CHARGE BACKS OR OTHER DEBITS FROM CUSTOMER OR ANY CUSTOMER OF CUSTOMER No Guaranty Nonapplication of Warranty COMPANY does not guaranty or warrant that the operation of hardware software or firmware will be uninterrupted or error free Further the warranty shall not apply to defects resulting from 1 Improper or inadequate maintenance by CUSTOMER 2 CUSTOMER supplied software or interfacing 3 Unauthorized modification or misuse 4 Operation outside of the environmental specifications for the product 5 Improper site preparation or mainte nance or 6 Imprope
20. Timeslot Screen 16 FAS Framing Structure 17 MFAS Frame Structure 18 Test Pattern Selection Screen 20 User Test Pattern Screen 20 Transmitter Screen 22 Summary Results Screen 23 Signal Frequency Results Screen 24 Frequency Results Screen 24 Frequency in ppm Screen 24 Error Screen 25 Error Rates Screen 25 CRC 4 Multiframe Format 27 Signal Errors Screen 28 Framing RAI Screen 28 G 821 Results Screen 1 29 G 821 Results Screen 2 29 G 821 LIVE Screen 30 G 821 DGRM Screen 30 First G 826 Measurements Screen 31 Second G 826 Screen 31 M 2100 550 Results Screen 32 Function Menu Screen 1 33 Date amp Time Screen 33 SunLite E1 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 Set Idle Codes Screen 33 Profiles Screen 34 Function Menu Screen 2 35 Test Duration Screen 35 Deley Timer Setup Screen 37 Delay Timer Countdown Screen 38 Send Frame Words Screen 38 Send NFAS Frame Words Screen 38 Function Menu Screen 3 39 M 2100 550 Parameters Screen 39 Clock Calibration Screen 39 Error Injection Screen 40 Function Menu Screen 4 41 Loop Code Screen 41 Loopback Screen 42 Propagation Delay Screen 43 Function Menu Screen 5 44 Line Code Selection Screen 44 Auto Stress Results Screen 45 Function Menu Screen 6 45 View Received Data Screen 47 VF Screen 1 48 VF Screen 2 49 VF Screen 3
21. a companding characteristic known as A law is used A law intends to provide optimum signal to noise performance over a wide range of transmission levels In North America the encoding is done according to the u law Therefore the companding law used for encoding the voice signal must match that for decoding for distortion free transmission PROPAGATION DELAY Measure the propagation delay on a looped back signal 1 The circuit must be looped at the far end to perform this measurement If no loopbackis in place you will see a warning message 2 Press G gt to start measuring 3 The measurements are displayed in Unit Intervals and micro seconds PROPAGATION DELAY UI A us A PRESS ENTER Figure 48 Propagation Delay Screen 43 Here is the next Function menu screen LINE CODING a FREG RESOLUTION AUTO STRESS LANGUAGE SELECTION y Figure 49 Function Menu Screen 5 LINE CODING Set the line coding Options HDB3 default AMI LINE CODE HOBS Figure 50 Line Code Selection Screen FREQ RESOLUTION Set the frequency resolution of the measure ment Options 1 HZ 0 1 HZ 0 01 Hz 1 Hz is the default setting In order to have a frequency resolution of 0 1 or 0 01 Hz the test set will take 10 or 100 seconds to show the actual value and will update the value every 10 or 100 seconds AUTO STRESS Test a looped back signal The test set will change the frequency in steps to both the m
22. aximum and minimum frequencies until bit and or code errors are received Press GD to begin testing with the following screen 44 SunLite E1 Ts FREQ 2661668 CODE ERR A BIT ERR amp RT 6B B 8S Figure 51 Auto Stress Results Screen LANGUAGE SELECTION Choose the test set s working language Options English French Italian German Here is the final Function menu screen LINE TERMINATION a ALARM GENERATION 6 621 ALLOCATION WIEW RECEIW DATA y Figure 52 Function Menu Screen 6 LINE TERMINATION Adjust the calibration table for signal level measurement depending on the unit s installed interface Options 75 OHM 120 OHM Technology Note Alarms AIS Generated upstream in response to a loss of signal FAS RAI Frame Alignment Signal Remote Alarm Indication Indicates upstream loss of FAS framing Framing required MFAS RAI Multiframe Remote Alarm Indication Indicates upstream loss of MFAS framing Only with PCM 30 framing 45 ALARM GENERATION If desired choose an alarm to generate for network testing Options AIS FRAI MFRAI e Press DP to ENABLE or DISABLE each alarm Remember to DISABLE all alarms when you are through testing G 821 ALLOCATION Program certain G 821 threshold parameters to be met in the Results Options e SES G 821 1 0x10 9 9x10 e DGRM G 821 1 0x10 9 9x10 e HRX 15 30 70 85 100 OFF In order to enter your own values in the follow ing se
23. bserve Channel Associated Signalling on all 30 channels dD 51 Histogram measurements 52 Observe Sa bit status 14 SunLite E1 4 Menu Parameters This section will guide you in the key menu and option selections for setting up the test set Technology Notes provide information about the technology behind the choices and are enclosed in frames On power up the test set does a self test after which it displays the Version Option screen Press to begin configuration Use and gt to move to the cursor _ Press GD and lt gt to scroll between screens Press gt gt to select options 4 1 Configuration Key Before connecting configure the test set MODE Ei FRAME cUNFRAME INPUT MONITOR Ts CLE cINTS6666 Figure 7 Set Up Screen MODE Select the test rate Options E1 Nx64k e 1 Test at a full 2 048 Mbit s e Nx64k Test at fractional testing If Nx64k is selected the timeslot selection screen is displayed after pressing or MODE Hx64k TS504 2 TOGO PARANA ARA TOLZ ARAS RA ARA TAg ees y Figure 8 PCM 30 Timeslot Screen MODE Hx64k TS31 2 e TOGO PARAR ARA TOLZ AAAs T3524 ARANA y Figure 9 PCM 31 Timeslot Screen 1 Use gt Y and toselectthe desired timeslot The selected timeslotis underlined Timeslots O and 16 will be skipped in PCM 30 and TS 0 will be skipped in PCM 31 The active timeslot is underlined TS 4 in Figure 8 TS 31 in Figure 9 Unused timeslot
24. but is no longer occurring press to clear O siena OPCM 30 PCM 31 CRC 4 Ocot OsSyYNCH OBT O ERROR OAS O RAI OTX O RUN Figure 3 LEDs SIGNAL e Green Receiving E1 pulses e Red Not receiving pulses PCM 30 PCM 31 e Green Receiving framing as expected e Red Framing expected not received CRC 4 e Green CRC 4 received as expected e Red CRC 4 expected not received CODE e Red Code error received SYNCH e Green Synchronized on received test pat tern e Red Synchronization has not been achieved BIT e Red Bit error received ERROR e Red Code bit bitslip CRC 4 E bit or Frame error received 6 SunLite E1 AIS e Red Receivingan unframed all ones signal Alarm Indication Signal RAI e Red Remote Alarm Indication received TX e Green Transmitting e Flashing green Transmitting in self loop mode e No light Not transmitting RUN e Green Measurements are being taken Power Located to the right of the COD power key e Red Battery running low e Green Test set is fully charged and or plugged into the adaptor 1 2 Keys The test set has two sets of keys The central set controls the most basic functions The lower portion controls specific functions and actions Notes e WhenD scroll has been released for more than a second the parameters are set e The cursorleft decrease key decreases the internal clock frequency for clock calibration and t
25. ect water splash environment Input Connectors These connectors are intended for connection to E1 circuits only e Maximum input voltage is 12VDC Dip Switch Information The six dip switches located in the battery compartment see Figure 6 are intended for factory test and programming use They should be left in the positions indicated in the following figure for normal operation ON_ CTS 123456 Figure 1 Dip Switch 4 SunLite El 1 General Description Welcome to the SunLite E1 This compact lightweight and versatile test set allows you to perform many E1 tests Accept a circuit check for quality observe signalling information the SunLite E1 performs all of these functions and more via a simple keypad oriented user interface This manual will introduce you to the SunLite E1 You will be led through test setup and shown how to perform applications If you have questions please call your dis tributor or Sunrise Telecom s Customer Service department Sunlite 1 MODE El H Volume c FRAME PCM 38C ontrast INPUT MONITOR TX CLK INT a908008 C SUNRISE TELECOM r Serial Port OSiGNAL Orcm3o Opcmsi O CRC Ocome OsyncH OBT O ERROR Om Om On O RUN Figure 2 SunLite E1 Front View 1 1 LED Panel Just below the LCD screen is a group of LEDs see Figure 3 Most of these LEDs reflect received information A flashing red LED in dicates an error or alarm has occurred in the past
26. ed low battery 62 SunLite E1 E1 General Bit Error test rates 2 048 Mbit s N contigu ous and M noncontiguous x64 kbit s N 8 M 1 to 31 Drop and insert to internal test circuitry N or Mx64 kbit s y A law decoded VF channel to built in speaker Line Coding HDB3 amp AMI Framing Unframed PCM 30 PCM 30C PCM 31 PCM 31C Conforms to ITU T G 704 TEST PATTERN GENERATOR General 1111 0000 0101 RICAR 3 PRBS 2n 1 n 9 11 15 23 Conforms to ITU T 0 151 0 152 0 153 and ANSI V 52 V 57 Programmable 3 patterns each up to 16 bits long Test pattern inversion Transmitter Clock source Internal clock 2 048 MHz 25 ppm Received locked to received signal External locked to Reference clock input signal Line coding HDB3 amp AMI Pulse shape Conforms to ITU T G 703 75Q Unbal 2 37 Vbp 10 Programmable Timeslot 0 Programmable loop up loop down code and NFAS word Set idle channel code and ABCD bits IDLE NOT IDLE state Transmit signal can be turned ON OFF or internally looped Error injection BIT CODE BIT CODE single or rate of 1x107 to 1x10 CRC 4 FRAME E bit single 0 128 bit zero insertion in 8 bit steps 63 Receiver Frequency range 2 048 Mbit s 6000 bit s for SLE1 Input Sensitivity Terminate Hi Z 6 to 43 dB with Automatic Line Build Out ALBO Monitor 20 dB resistive loss combined with 6 dB cable loss Auto configuration for framing PCM
27. g TX REFCLK RX with alligator clips HiZ Bridging with a T Connector HiZ Figure 63 Monitoring an In Service Circuit 55 6 3 Measuring Propagation Delay 1 Press and configure the test set as required 2 Connect to the circuit as shown in Figure 64 REFCLK RX Loopback Figure 64 Propagation Delay 3 Press gt then press gt 4 Select PROPAGATION DELAY and press QD 5 Observe the delay on the looped circuit 56 SunLite E1 6 4 Frequency Synchronization Set TxCLK to EXTERNAL when checking for frequency synchronization TX REFCLK RX Figure 65 Frequency Synchronization 57 6 5 Measuring Signal Level 1 Press and configure the test set as required 2 Connect to the circuit as in Figure 66 TX REFCLK RX OO Q Figure 66 Measuring Signal Level 3 Press gt and then B 4 Page down to the SIGNAL FREQUENCY screen and observe LVL signal level SICHAL FREQUENCY 2 LUL 2 9 de REC ppm 8668 MIA ppm 00HH y Figure 67 Signal Frequency Screen 58 SunLite E1 6 6 Channel Associated Signalling 1 Connect to the circuit as in Figure 63 2 Press and observe the Channel As sociated Signalling for each timeslot as in Figure 68 348 CH CAS TS1d X Figure 68 CAS Sample Screen 6 7 Voice Frequency Channel Monitoring 1 Connect to the circuit as in Figure 63 2 Press GD to access the VF screen shown in Figure 69 Ta TS Bl 2 Ra TS Bl INSERT QU
28. gure 41 Function Menu Screen 3 M 2100 PARAMETERS Set M 2100 550 parameters HRP Options 00 to 99 PERIOD Options 1 MIN 15 MIN 1 HR LAST 12100558 HRP 348 PERIODA MIH Figure 42 M 2100 550 Parameters Screen 1 At HRP press to enter a digit press to move the cursor 2 At PERIOD press gt gt to select a period CLK CALIBRATION Set the internal clock frequency CLOCK CALIBRATION INC 1 Hz DEC i Hz PRESS ENTER TO SET Figure 43 Clock Calibration Screen 1 Press and set TX CLK INT 00000 2 Connect the TX port to a calibrated unit or an external frequency counter e f using an external frequency counter change the LINE CODING in D to AMI then select 1111 PATTERN in 39 3 4 5 6 Press to increase or decrease the internal clock frequency in 1 Hz steps Look at the frequency counter or calibrated unit to check the alignment Continue until the frequency is measured at 2048000 Hz if using a calibrated unit or at 102400 half the frequency if using an external frequency counter Press GD to set the calibration AUDIBLE ALARM Options ON OFF If ON a beep sounds during an error or alarm ERROR INJECTION Set the error injection parameters Na o o o 40 TYPE BIT CODE BIT amp CODE CRC 4 FRAME EBIT ZEROES MODE RATE BURST dependenton error type RATE 1x10 to 1x10 7 ZEROES 8 16 24 128 BIT 1 50 BIT CODE 1 16 P
29. he timeslot selection in VF measurements as well as moves the cursor in the indicated direction e The gt cursorright increase key increases the internal clock frequency for clock calibration and the timeslot selection in VF measurements as well as moves the cursor in the indicated direction e Repeatedly pressing M stop will have no affect Start Restart Automaticaly look measurements Cursor Up for framing and and the delay test pattern timer 27 Cursor Cursor left or Tee Sa right or decrease SO increase Stop measure Press to access ments Cursor Down the test results and the delay screen timer Select Parameters Figure 4 Center Keys 8 SunLite E1 Lower group of keys The following keys are shown in Figure 2 Err Displays the configuration screen Q Displays the test pattern screen 4 Page up through available screens gt Displays VF measurements Cas View the Channel Associated Signalling on the received line gt Page down through available screens gt Send the Loop Down code selected in the Loop codes screen in the D menu gt gt Send the Loop Up code selected in the Loop codes screen in the D menu Cs View the status of the received Sa 4 8 bits gt Print the screen If viewing results or VF measurements all screens will be printed In profiles the selected profile will be printed u gt Displays histogram screens Go Turn the transmitter on off or to enter the self
30. hms 1 kHz 80 AM modulation I the undersigned hereby declare that the equipment specified above conforms to the above Directive and Standards Full Name Dennis Koo Position VP Quality Group Company Sunrise Telecom Inc Address 302 Enzo Drive San Jose CA 95138 USA Telephone 408 363 8000 Facsimile 408 363 8313 Date 10 20 04 71 72 SunLite E1 A ABCD Bits 49 ALARM GENERATION 46 Applications 54 Accept a New 2 048 Mbps Circuit 54 Channel Associated Signalling 59 Measure Propagation Delay 56 Measure Signal Level 58 Monitor an In Service Circuit 55 Monitor a Voice Frequency Channel 59 N or M x64 kbps Testing 61 Send Receive Digital Tones 60 Audible Alarm 40 Auto Stress 44 B Batteries 12 Cc CAS 33 Channel Associated Signalling 50 Clock Calibration 39 coding 44 Companding Characteristic 43 Connectors 5VDC 10 BNC 10 Rx 10 Connectors and Controls 10 Controls Contrast Control 10 Volume Control 10 CRC 4 27 D Definitions 13 Delay Timer 37 dip switches 4 73 E E bit Transmission 27 Erase NV RAM 42 Error Injection 40 F Figures 01 02 03 04 05 06 07 08 09 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 74 Dip Switch 4 SunLite E1 Front View 5 LEDs 6 Center Keys 8 SunLite E1 Top Panel 10 Sunlite E1 Back View 11 Set Up Screen 15 PCM 30 Timeslot Screen 15 PCM 31
31. in to unlock the saved test DELAY TIMER Set a start time before measurements begin DELAY TIMER MODE OH START 45 59 PRESS START Figure 37 Deley Timer Setup Screen Options MODE ON OFF Press gt gt to select OFF ON If ON START is available Enter the delay desired 01 minutes 99 hours 99 minutes by pressing gt gt to select a digit and to move the cursor Press and the countdown screen is displayed as in Figure 38 Measurements will begin when the delay has expired Press ll to cancel 37 COUNTOOWH L 0 TIME Seis C K Figure 38 Delay Timer Countdown Screen SEND FRAME WORDS Modify the frame words if desired e E bit 00 01 10 11 AUTO where the test set replies to an incoming CRC 4 error e FAS W Modify the first bit to 1 or 0 e MFAS Modify bits 5 8 to O or 1 e NFAS Modify the Si bit 1 A bit bit 2 and Sa bits 4 8 When no CRC 4 is detected Si is setto 1 You may set the NFAS words for 8 frames 1 3 5 7 9 11 13 15 SEND FRAME WORDS 4 E BIT 4H FAS W 106811611 MFAS W 66111 y Figure 39 Send Frame Words Screen FR FAS WORD 2 A456756 Ii 10140411111 3118911111 Figure 40 Send NFAS Frame Words Screen e Factory defaults E bit Auto MFAS 00001101 NFAS 1 bit 1 A 0 Sa 4 8 1111 38 SunLite E1 Here is the next Function menu screen 1 2188 PARAMETERS 2 CLE CALIBRATION AUDIBLE ALARM ERROR INJECTION y Fi
32. is supposed to result from a zero voltage input to the encoder and the code that actually occurs e CH DATA View the live 8 bit channel data 49 Press O to view the screen shown in Figure 57 5A 608 dB 2 PSOPH 33 6 dBm0 SK FL 95 dBmO Figure 57 VF Screen 4 e S N Signal to Noise ratio reported in dB e PSOPH Psophometric filter measure ment e 3K FL 3 K Flat noise measurement 4 7 CAS Key e Observe the Channel Associated Signalling on all 30 channels e You must have PCM 30 C framing or a PCM 30 FRAMING REQUIRED message is displayed if you attempt to enter CAS without proper framing 36 CH CAS TSi1 Figure 58 CAS Screen e Timeslots 1 to 10 are shown on the first line 11 to 20 on the second and 21 to 30 on the third e Idle channels are marked with an e Active channels are marked with a X 50 SunLite E1 4 8 Gw gt Histogram Key HISTOGR CURRENT ACTION VIEW START O 64 12 82 START 7 12 66 68 Figure 59 Histogram Menu Screen View print or save a histogram Options HISTOGR CURRENT SAVED ACTION VIEW PRINT SAVE 1 a 5 Select a histogram to view by pressing p gt Select an ACTION VIEW Press G gt and a Histogram data screen is displayed as in Figure 60 PRINT Press G gt and the histogram is printed SAVE Press G gt and the measurement will be saved with a date and time stamp To select the time period that the results wi
33. ission performance from any point on the circuit Time Slot 0 M SM Bit FRM FRM FRM 2 4 5 6 7 8 1 1 0 1 1 1 c1 0 c2 0 c3 1 c4 0 c1 1 c2 1 2 c3 E c4 E 27 Signal Errors LOSS HAHAHA LOFS BABS SYLS HAHAHA AIS alala lai Figure 22 Signal Errors Screen LOSS Loss of Signal Seconds is the number of seconds during which the signal was lost during the test LOFS Loss of Frame Seconds is a count of seconds in the test which experience a loss of framing SYLS Count of the number of pattern Synchronization Lost Seconds since the beginning of the test AIS Count of the number of seconds since the beginning of the test in which the test set received an AIS all 1s signal Framing RAI FAS FALrBHGHLG HFASRATrEAHHHH 28 Figure 23 Framing RAI Screen FAS RAI Count of the seconds during which Frame Alignment Signal Remote Alarm Indication was received MFAS RAI Count of the seconds during which Multiframe Alignment Signal Remote Alarm Indication was received SunLite E1 G 821 Results Gazi 1 5 BIT ERR A ES A SES A Figure 24 G 821 Results Screen 1 e BIT ERR Count of Bit Errors received since the beginning of the test BER in the percentage screen is Bit Error Rate e ES Count of Errored Seconds received since the beginning of the test An errored secondis any second with atleast one BPV bit error FBE or CRC 4 error e SES Count of the Severely
34. lections press gt gt to increase the value of the digit you have selected Press to move cursor within the rate e SES Severely Errored Seconds Select G 821 and the threshold is set to the G 821 standard of 1x10 Use the and keys to enter your own standard DGRM Degraded Minutes Select G 821 and the threshold is set to the G 821 standard of 1x10 Use the and GD keys to enter your own standard e HRX Define the portion of the international connection The default setting is OFF Use the and GD keys to enter your own standard 46 SunLite E1 VIEW RECEIVE DATA View the data received at the RX port TS BIHARY HE 2 BA HABLLA11 96 Bd 111111 C9 az Higaan 45 y Figure 53 View Received Data Screen The data for each timeslot TS is displayed in binary and hexadecimal formats e Press G gt to view all of the timeslots 4 6 gt VF Measurements Key Press to access Voice Frequency functions e The speaker turns on automatically e Framing is required for VF functions e You can monitor a voice channel and ob serve various results e Only available with the VF hardware option Ta T5 al 2 Re TS al INSERT TONE Ts Fo LUL 10207 00 y Figure 54 VF Screen 1 Options TX TS Transmit Tmeslot 1 to 31 RX TS Receive Timeslot 1 to 31 INSERT TONE TALK QUIET Tx FQ LVL 0 to 3999 Hz 3 to 60 dBm 1 Select the Tx TS the timeslot you want to transmit on using
35. ll show select PERIOD Select from DAYS HOURS or MINUTES Observe the START and STOP times of the selected histogram Press gt gt to page through the errors Figure 60 Histogram Measurements Screen To choose which result you will see first select TYPE and choose LOSS AISS LOFS FAS RAI MFAS RAI BIT CODE or FE In the Histogram screen press gt gt to see all results 51 Interpreting Measurements Horizontal axis A period of time day hour or minute for every two dots Vertical axis Error count value every three dots starting with 10 ending with 10 000 000 Press w to see the period of time for the graphic screen Press gt gt to go to the associated screens for example one day with one minute resolution will have 24 screens The test set can show up to 24 pages of 1 hour with 1 minute resolution Type Error types BIT CODE FE LOSS AISS LOFS FAS RAI MFAS RAI See Section 4 4 for error definitions Press M to stop an in progress histogram analysis 4 9 Sa Bits Key 52 Press to observe Sa bit status The bits are reported horizontally from Frame 1 through 15 Press C gt C4 gt to view all screens FRI SA4 11111111 SAS 11111111 SAB 11111111 Figure 61 Sa bits Screen SunLite E1 5 Firmware Upgrading Use one of the following procedures to upgrade your firmware via the serial port 5 1 CPU Download 1 Onthe DIP switch DP1 inside the battery compartment
36. mitted on the non selected channels PATTERN e15 INUERSIONENABLE Figure 12 Test Pattern Selection Screen PATTERN Options 2e15 2e9 2e11 2e23 1111 0000 1010 RICAR 3 User 1 User 2 User 3 LIVE LOOP 20 Select a standard test pattern 2e15 2e9 2e11 2e23 1111 0000 1010 or RICAR 3 LIVE This option has the test set stop look ing for a test pattern and simply measure the live signal The test set will transmit idle code in all channels LOOP Transmits the received signal PATTERN USERL INVER S IOH 0 SABLE Figure 13 User Test Pattern Screen Select and Enter a User Pattern by Pressing gt to select User1 User2 or Users Select the third line of the screen as in Figure 13 and at each bit location press to select 0 1 or none A user pat tern may be from 1 to 16 bits long Select none in the middle of the pattern and all remaining bits will be set to none SunLite E1 INVERSION Choose whether to send the test pattern in an inverted form 1s and Os reversed Options DISABLE ENABLE Technology Note Standard Test Patterns 2e 1 where n 9 11 15 20 23 are pseudo random bit sequences The signal is formed from a 9 11 15 20 or 23 stage shift register and is not zero constrained The patterns conform to the ITU 0 151 technical standard 1111 The all 1s pattern is used for stress testing circuits If the pattern is sent unframed it will be interpreted
37. n the same submultiframe will lead to only one CRC 4 error for the block Also it is possible that errors could occur such that the new CRC 4 bits are calculated to be the same as the original bits CRC 4 uses a multiframe structure consist ing of 16 frames as shown in the next figure The CRC 4 multiframe is not necessarily aligned with the MFAS multiframe Each CRC 4 multiframe can be divided into 2 sub multiframes SMF These are labeled SMF 1 and SMF 2 and consist of 8 frames apiece We associate four bits of CRC information with each submultiframe 26 SunLite E1 gt PO gt O gt ODPO WwW ZO0O 20 20210 0 0 0 0 oo Notes SM FRM 1 Sub Multiframe 1 Sa Spare bit reserved for National Use A Remote Alarm FAS Remote Alarm Indication Frame Alignment Signal Pattern 0011011 CRC 4 Frame Alignment Signal 001011 CRC multiframe is not aligned with MFAS timeslot 16 multiframe SM FRM 2 Sub Multiframe 2 E E bit Errors c1 c2 c3 c4 CRC bits Figure 21 CR 4 Multiframe Format Technology Note E bit Performance Monitoring When the terminal equipment of a 2 048 circuit is optioned for CRC 4 transmission E bit transmission may also be enabled The terminating equipment transmits E bits on the 2 048 Mbit s line when it receives a CRC 4 error E bit error transmission is a relatively new feature in 2 048 transmission E bit transmission allows a 2 048 Mbit s in service circuit to be reliably monitored for transm
38. nds An SES containing equal or greater than 30 EBs e Press pp to see the results in a percentage format G 626 3 4 ES 99999 UAS 199999 AS 999999 Figure 29 G 826 Measurements Screen 2 e ES Count of Errored Seconds e UAS Count of Unavailable Seconds AS Count of Available Seconds M 2100 550 Results 1 2104 558 ES 55 555 DES 55 555 PF FAILED Figure 30 M 2100 550 Results Screen Measurements are based on the MEASURE MENT PERIOD and HRP MODEL which is set via En ES Percentage of Errored Seconds which have occurred since the start of the test SES Percentage of Severely Errored sec onds which have occurred since the start of the test P F Specifies whether the M 2100 550 test is PASS or FAIL for the specified HRP MDEL and time period 32 SunLite E1 4 5 gt Function Key Select function parameters from six screens TIME amp DATE SET IDLE CODES PRINT PERIOD PROF ILE Figure 31 Function Menu Screen 1 DATE amp TIME Y MN OO 84 11 26 HH INS 12 06 06 Figure 32 Date amp Time Screen TIME amp DATE Set the current time and date in the set 1 Press or gt to place the cursor 2 Press gt gt to select and set each digit 3 Press w or 4 to select the other line 4 Press E to return to the Function menu SET IDLE CODES Determine the pattern the unit will send on un used channels Channel Associated Signalling CAS idle code is al
39. onncnannos 23 4 5 GD Function Key ococconcnonocannnnonnos 33 4 6 4D VF Measurements Key 48 4 7 CAS Key cococccccocococnocininnnnnonnnos 50 4 8 Cu Histogram Key eee 51 4 9 Sa Bits Key oo 52 5 Firmware Upgrading ccssssessn 53 5 1 CPU Download 53 5 2 FLASH Memory Download 53 5 3 DSP Download cocconccccoccconcicncccanccnnnnos 53 6 ApplicatioNS ooommccnnccnnmenenscrriacnnos 54 6 1 Accept a New 2 048 Mbit s Circuit 54 6 2 Monitoring an In Service Circuit 55 6 3 Measuring Propagation Delay 56 6 4 Frequency Synchronization 57 6 5 Measuring Signal Level 58 6 6 Channel Associated Signalling 59 6 7 Voice Frequency Channel Monitoring 59 68 Send Receive Digital Tones 60 6 9 N or M x64 kbit s Testing 61 7 Specifications cceeceeeeseeeeeeeeees 62 8 Express Limited Warranty 68 9 Declaration of Conformity 71 Important Safety Information NwARNINGS e Use NiMH batteries only e Use SA143 or equivalent AC adaptor to charge the NiMH batteries e Use only Sunrise Telecom 120 2101 1 120 replacement NiMH batteries Operating Environment This test set is intended for operation in at least partly weather protected and temperature controlled locations as per IEC 721 3 7 Class 7K2 Do not operate this test set in rain or in a dir
40. or here The test set may be operated with a discharged battery provided the charger is connected The battery will charge during operation 10 SunLite E1 Back Side This side of the test set contains e Speaker e Microphone e Battery Compartment Speaker Release Tab Battery Cover Retaining Batteries F Microphone Figure 6 Sunlite E1 Back View 1 4 Batteries The test set s internal batteries are accessed through the back of the test set Refer to Figure 6 and the following instructions on changing the batteries A WARNING Use NiMH batteries only Use SA143 or equivalent AC adaptor to charge the NiMH batteries Use only Sunrise Telecom 120 21011 120 replacement NiMH batteries Replacing the NiMH batteries 1 12 Remove the battery compartment cover by pressing the Release tab towards the center of the cover and then lift the cover off Remove the old batteries by pushing each battery againstthe spring and lifting upward You may need a flat tool such as a small screw driver to accomplish this Insert the new batteries by pressing the negative end of each battery against the spring as indicated in the battery compart ment and push each battery into place Replace the cover by inserting the retaining tabs into their slots and then gently push the cover down into place SunLite E1 2 Basic Definitions Here are some abbreviations you will run into and their definitions AIS Alarm
41. r installation by CUSTOMER SunLite E1 9 Declaration of Conformity Application of Council Directive s 89 336 EEC the EMC directive Manufacturer s Name Sunrise Telecom Inc Manufacturer s Address 302 Enzo Drive San Jose CA 95138 USA Manufacturer s Telephone Number TEL 408 363 8000 FAX 408 363 8313 Equipment Type Environment Measurement Control and Laboratory Equipment Trade Name Model Number SLE1 Sunlite E1 Standard s to which Conformity is Declared EN 61326 1998 IEC 61326 1997 Electrical Equipment for Measurement Control and Labora tory Use EMC Requirements EN 55022 1995 Class A Radiated 8 Line Conducted Emissions Requirements for ITE EN 61010 1 Safety Requirements for Electrical Equipmentfor Measurement Control and Laboratory Use Part 1 General Requirements Immunity panor Standard Description Severity Applied mance Criteria IEC 1000 4 2 Electrostatic 4 kV direct and indirect c EN 61000 4 2 Discharge contact 4 kV air IEC 1000 4 3 Radiated RF 3V m 80 1000 MHz 80 A ENV 50140 204 Immunity AM with 1 kHz sine wave IEC 1000 4 4 Electical 4 4 kv on AC lines 0 5 5 EN 61000 4 4 h kV on I O lines sient Burst IEC 1000 4 5 Surge Im 0 5 kV IM 0 5 kV B ENV 50142 munity Test CM1 2ms 50ms T Th 1 O lines gt 3 m and AC DC IEC 1000 4 6 Conducted and Earth Port lines 3V rms A ENV 50141 RF Immunity 0 15 80 MHz 150 o
42. ress gt gt to select the type of error to inject For all errors exceptfor ZEROES FRAME and EBIT use BURST to inject a single er ror Use RATE to inserta continuous stream of errors at a given rate then press to select the rate in the following screen ERROR INJECTION TYPE BIT CODE MODE RATE RATE 1x18 2 Figure 44 Error Injection Screen Select RATE to pick the injection rate SunLite E1 4 Press Gp anderrors of the specified TYPE and COUNT or RATE are injected e f ZEROES is selected as the error TYPE the mode will be BURST The test set will inject consecutive zeroes in the test pattern to the selected INSERT NUMBER e Select FRAME or EBIT errors and a single error is injected at a time Here is the next Function screen LOOP CODES ERASE HU RAM COMPAND ING PROGATION DELAY Figure 45 Function Menu Screen 4 Technology Note Standard Loopbacks Loopback 1 is based on ETR 001 Sa6 bits have a 1111 code When the loopback is complete the Sa5 bit sent from the digital switch to the terminal equipment will be 0 Loopback 2 is based on ETS 300 011 Sa6 bits have a 1010 code and the Sa5 bit received after the loopback is complete will be 0 LOOP CODES Select the loop code to be transmitted after pressing gt or GD Options TYPE PATTERN STANDARD LOOPBACK 1 LOOPBACK 2 SA BIT SA4 through SA8 TYPE PATTERN SA BIT 5A4 U A666111611111111 0 H611166611111111 Figure 46 Loop Code
43. s X Active timeslots 2 Press to select and deselect timeslots 3 Press or GD to return to the configu ration screen Technology Note E1 Rate The E1 signal is transmitted at a rate of 2 048 Mbit s The rate is achieved by multiplexing 32 individual 64 kbit s bitstreams timeslots in the 2 048 signal FRAME Select the desired framing type Options PCM 30 PCM 30C PCM 31 PCM 31C UNFRAME Notes e PressAUTOtohave the test set auto synch on the received E1 framing e A C added to PCM 30 and PCM 31 indi cates enabling of CRC 4 error checking 16 SunLite E1 Technology Note E1 Framing E1 transmission utilizes two main types of framing Frame Alignment Signal FAS and MultiFrame Alignment Signal MFAS The next two figures show a graphic representa tion of these types of framing One 2 048 Mbit s Frame Time soto 1 31 BITS E 1 i 2 3 4 5 6 7 8 jefofo 1 o 1 1 E 1 a sajsajsa salsa Notes 8 bits per timeslot x 8000 frames per second 2 048 Mbps Even Frame Contains Frame Alignment Signal FAS Odd Frame No Frame Alignment Signal NFAS Sa This bit is reserved for National Use E This is the error indication bit A This is remote alarm indication bit FAS 0011011 Frame Alignment Signal Figure 10 FAS Framing Structure Le Z pue G sjo seu ul sjeuueyo 39104 DE YPM p PIUSULI a e S WLJA S WLI 9 JO S SISUOD WENU SVAN Bu euBbis 9 10 sau
44. so set in this screen SET IDLE CODES IOLE CH 10101814 IDLE CAS 1611 Figure 33 Set Idle Codes Screen Press or gt to place the cursor Press to select and set each digit Press w or 4 to select the other line Press D to return to the Function menu Note The default idle code is 00000000 the default idle CAS is 1101 Pon 33 PRINT PERIOD Determine when the test set will send results to the serial port to be printed Options NOW 5 MIN 15 MIN 1 HR 24 HRS LAST EVENT OFF e NOW The results are printed every time is pressed e 5MIN 15 MIN 1 HR or 24 HRS Results are printed every time the selected period of time has passed e LAST Results are printed when the mea surements are finished or stopped e EVENT Prints a event report e OFF Disables the print function PROFILE Save or invoke a system profile A system profile includes configuration and function parameters The test set will power up using its last configuration PROF ILE USERL ACTION SAUE PRESS ENTER Figure 34 Profile Screen Options USER1 to USER10 CURRENT Action SAVE RECALL DELETE PRINT e USER1 to 10 The following actions are available SAVE Use to save the Current Profile via the following procedure 1 Press to select a USER number for the name of the profile 2 Press w to select ACTION Press D to select SAVE Press GD 34 SunLite E1 Poe Note If 10 profiles are stored any new
45. t and peak code measurement Environmental Operating temperature 0 C to 50 C Storage temperature 20 C to 70 C Humidity 5 to 90 non condensing 66 SunLite E1 General Store Up to 10 instrument configurations Display 122 x 32 dots 4 x 20 characters 6 x 8 dots size with LED backlight Internal Battery NIMH rechargeable Battery Life 4 hours with transmitter off Charge Time 7 hours Charger 5V 2A 90 to 265 VAC 50 60 Hz Languages English Italian French German Size 175 mm I x 75 mm w x 35 mm d Weight 0 4 kg 67 A 68 8 Express Limited Warranty Hardware Coverage COMPANY warrants hardware products against defects in materi als and workmanship During the warranty period COMPANY will at its sole option either i refund of CUSTOMER S purchase price without interest ii repair said prod ucts or iii replace hardware products which prove to be defective provided however that such products which COMPANY elects to replace must be returned to COMPANY by CUSTOMER along with acceptable evi dence of purchase within twenty 20 days of request by COMPANY freight prepaid Software and Firmware Coverage COM PANY warrants software media and firmware materials against defects in materials and workmanship During the warranty period COMPANY will at its sole option either i refund of CUSTOMER S purchase price without interest ii repair said products or iii replace sof
46. tware or firmware products which prove to be defective provided however that such products which COMPANY elects to replace must be returned to COMPANY by CUSTOMER along with acceptable evidence ofpurchase within twenty 20 days of request by COMPANY freight prepaid In addition during the warranty period COMPANY will provide without charge to CUSTOMER all fixes patches new releases and updates which COMPANY issues during the warranty period COMPANY does not warrant or repre sentthat all software defects will be corrected In any case where COMPANY has licensed a software product AS IS COMPANYS obliga tion will be limited to replacing an inaccurate copy of the original material SunLite E1 C Period The warranty period for Hardware Software and Firmware will be One 1 Year from date of shipment to CUSTOMER The COMPANY may also sell warranty exten sions or provide a warranty term of three years with the original sale which provide a longer coverage period forthe test setchas sis software and firmware in which case the terms of the express limited warranty will apply to said specified warranty term D Only for CUSTOMER COMPANY makes this warranty only for the benefit of CUS TOMER and not for the benefit of any subsequent purchaser or licensee of any merchandise E LIMITATION ON WARRANTY THIS CON STITUTES THE SOLE AND EXCLUSIVE WARRANTY MADE BY COMPANY WITH RESPECT TO HARDWARE SOFTWARE AND FIRMWARE
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