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1. J Oe AA AA n ir NE er l rpPpPT FE sites LETI TEEN Hg LL IH Hum MU ga tan ooo od 1 MA MAMA PAN 78 42GC8 AFO 208500 rcr sc a RoHS 2GB SO E i ry ELI 13 y E E a di Nn rx Rd LA kang t E ir WA i i L j Bia I pi Fie Sit AN L uf t ic pi 44 Ee n 1 gt Hae e Ta ar 1 TRI i wal pa 1 i E h 5 Ti A Pa F 4 AN 1 am T re G A wd L At aki m GA a p z E fi A 4 L dd is T asa d ka a ate P F TES Ka a L pi Y ke F f HII p 1 pem E ai WA un La idi THOR N7 A LL a Lhe zr api of 1 a if Te oed te w bi Wi E i de z 3 VW 4 dt eni e LEN wL i Cu P Sm ee t D ot ay T t i aoe d d gt Der eb ki i m W n ai D 5 LI vi da T E 1 sti ua n gt y pa III A LM AI IIA AA ui Issued Date Jun 11 2013 Cerpass Technology Corp Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No Ab of A13 A Cf a CERPASS TECHNOLOGY CORP Report No TECE1211068 A E ii Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No A6 of A13 2 a CERPASS TECHNOLOGY CORP Report No TECE1211068 A PIM 814BA15AO0DB TIM TAAFO2 MIN AP FMO04GL20055 DSM NAA a OO n TETTE AAA EE RUE JC UP ANG Du uw or Ur a MEME TT NETS TE
2. im dB 737250 16 78 2478 30 00 41 2 5 22 Note Level Reading Factor Margin Level Limit a MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 22 of 56 AC 230V Pol Phase VERTICAL Test Mode 1 VGA 2048 x 1836 LAN 1Gbps Test Date Nov 13 2012 Humidity 59 80 0 dBuV 7m 40 ClassB 10m Radiation Margin 6 dB 3 b DO 300 000 370 00 440 00 510 00 580 00 650 00 720 00 90 00 460 00 1000 00 MHz MHz dB m dBuV dBuV m dBuV m dB em 1 35100 as 3013 2720 ar00 orif oP woo 0 ja 2 x09 ase 3085 2829 sro a71 or vo o P s 40200 716 ara 3025 3700 675 oP 100 0 P 4 470 9000 550 3250 2660 3700 030 ae wo 9 P 5 502000 524 3450 2020 3700 rra ap nie v5 P e 036 7000 328 3442 3113 3700 5 amp 7 ap o 0 P Note Level Reading Factor Margin Level Limit i Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 23 of 56 YO CE AC 230V Pol Phase HORIZONTAL Test Mode 1 VGA 2048 x 1536 LAN 1Gbps Test Date __ Nov 13 2012 Humidity 80 0 dBuV 7m 30 000 457 50 85 00 112 50 140 00 167 50 195 00 222 50 250 00 305 00 MHz MHz dB m dBuV dBuV m dBuV m dB cm 1 531000 2051
3. ag f DC gt BRUS 3HLES f MO DEL AD1212LB 4 DC 12V 32 5521 zp ADDA CORP Se 2 Acc a IN TAM a Me Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No A10 of A13 a e C a CERPASS TECHNOLOGY CORP Report No TECE1211068 A JAR BEN KI AN LOU Gg 4 rt MM M aaa aaa aaa aaa aaa aaa aaa aaa aaa aa aaa aaa aaa aaa Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No A11 of A13 a CERPASS TECHNOLOGY CORP Report No TECE1211068 A C C MODEL NO di 98 4 4 FSP150 50LG AC INPUT 100 240 V 3 1 5A 60 507 MAX OUTPUT POWER 150W 3 3V A 5Vs85W DC OUTPUT 33V 10 0A ORG 8V 13 0A RED 12V 10 0ALYEL 5Vsb 2 0A PURP 12V 0 0 3A BLUE PP ZH M UE Urs 100 240V 3 1 5A 60 50H2 Mide SOW 433V A EV RBEW LAWA AA 33V z 100A E amp M B 5V 7713 0A hr s ir A 12V 10 04 4 A WA 45Vsbz z 2044 A F amp 12V 232 03A AE A PG ERA AAA M E 161 MANNAK A LAE IE AUER M can rau MARTE EA EH HOHFEK PU UA US iE FUP RU ee es ROHS RE swe Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No A12 of A13 e Cf a CERPASS TECHNOLOGY CORP Report No TECE1211068 A Cerpass Technology Corp Issued Date Jun 11
4. 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No A13 of A13
5. EM CLAMP for Signal Ports Temperature 23 C Relative Humidity 49 Atmospheric Pressure 1011 hPa Test Date Sep 12 2012 Frequency 0 15 80MHz Modulation AM 80 1KHz sine wave Dwell time 2 9s Frequency Step Size 1 9o of preceding frequency value Test Mode Voltage V 045 80MHz RJ45 LAN 10M 100M Note A Means the EUT function is normal working during the test Test engineer MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 49 of 56 O O C a CERPASS TECHNOLOGY CORP Report No TECE1211068 A 12 5 Test Photographs aa aaa aaa aaa aaa aaa aaa aaa aasa aaa aa aaa aaa aaa aaa aa aaa a Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 50 of 56 we CERPASS TECHNOLOGY CORP RepotNo TECE1211068 A ww 13 Power Frequency Magnetic Field Immunity Test 13 1 Test Setup GPR Ground plane C1 Power supply circuit A Safety earth C2 Signal circuit S Insulating support L Communication line EUT Equipment under test B To power supply source Lc Induction coil D To signal source simulator E Earth terminal G To the test generator 13 2 Test Severity Levels Magnetic field strength A m 1 O O O luli special NOTE 1 X is an open level This level can be given in the product specification 13 3 Measurement Equipment Manufact
6. The EUT and cables was isolated from the HCP by an insulating support 0 5 mm thick The VCP size 0 5 m x 0 5 m MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 35 of 56 YO CE 8 3 Test Severity Levels Contact Discharge Air Discharge Test Voltage KV of Level Test Voltage KV of Contact discharge Air Discharge 2 Specified X Specified Remark X is an open level 8 4 Measurement Equipment Instrument Model No Calibration Date Valid Date ESD SIMULATOR NSG438 2012 03 22 2013 03 21 MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 36 of 56 8 5 Test Result and Data Final Test Result PASS Pass performance criteria A Required performance criteria B Basic Standard IEC 61000 4 2 Product Standard EN 55024 2 4 8 KV for air discharge Ld 2 4 KV for contact discharge Temperature E 29 C Relative Humidity 56 Atmospheric Pressure 1011 hPa Test Date Sep 20 2012 Contact Discharge Air Discharge 25 times each 10 times each Voltage 2 KV 4 KV 2 KV 4 KV 8 KV PointiPolarity HCP A A A A VCP A A A A Case A A A A Screw A A A A Button A A A A A A RJ45 A A A A USB Po
7. 7 and figure Z1 of EN 61000 3 2 2009 the limits are not specified for equipment with a rated power of 75W or less The EUT meets the above condition so it conforms to EN 61000 3 2 MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 30 of 56 7 Voltage Fluctuations Test 7 1 Test Procedure The equipment shall be tested under the conditions of Clause 5 The total impedance of the test circuit excluding the appliance under test but including the internal impedance of the supply source shall be equal to the reference impedance The stability and tolerance of the reference impedance shall be adequate to ensure that the overall accuracy of 8 is achieved during the whole assessment procedure 7 2 Measurement Equipment Instrument Manufacturer Model No Serial No Calibration Date Valid Date FOW ka TTI HA1600 198226 2012 01 16 2013 01 15 Analyzer a Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 31 of 56 a oO CE e CERPASS TECHNOLOGY CORP __________ Report No TECE1211068 A Wu Mu 7 3 Test Result and Data Final Test Result PASS Basic Standard EN 61000 3 3 Temperature 25 C Test Data Nov 14 2012 Relative Humidity 52 Yo Supply Voltage 233 6 to 233 7 Vrms 332 5 Vpk Frequency 49 99 Hz THD 0 85 Crest Factor 1 423 peak at 89 8 deg Load Power 0 051 to 0 061 kW 0 077 K
8. Fax 886 2 2655 8200 Page No 44 of 56 11 Surge Immunity Test 11 1 Test Procedure a Climatic conditions The climatic conditions shall comply with the following requirements e ambient temperature 15 C to 35 C e relative humidity 10 Yo to 75 Yo e atmospheric pressure 86 kPa to 106 kPa 860 mbar to 1060 mbar b Electromagnetic conditions the electromagnetic environment of the laboratory shall not influence the test results c The test shall be performed according the test plan that shall specify the test set up with e generator and other equipment utilized e test level voltage current generator source impedance internal or external generator trigger number of tests at least five positive and five negative at the selected points repetition rate maximum 1 min inputs and outputs to be tested representative operating conditions of the EUT sequence of application of the surge to the circuit phase angle in the case of AC power supply actual installation conditions for example AC neutral earthed DC or earthed to simulated the actual earthing conditions d If not otherwise specified the surges have to be applied synchronized to the voltage phase at the zero crossing and the peak value of the AC voltage wave positive and negative e The surges have to be applied line to line and line s and earth When testing line to earth the test voltage has to be applied successively between e
9. SS a MH T 7 yaris en q y poun d FI gt d TREE A a t w el 4 a 4 e P vi E mpa wa m W a 1 1 j Y Ud EU T n M d STR a D 4 A E E a MW e Ng m v z Ki Tr qug A paa JU L a ci Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No A7 of A13 Na LO CE a CERPASS TECHNOLOGY CORP Report No TECE1211068 A P M 1 SA4V O de peara P m Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No A8 of A13 IP 2 Ce a CERPASS TECHNOLOGY CORP Report No TECE1211068 A Wo Western Kai AG SATA BAME Cache stermdig al com T 2 0TB D2002FAEX LL SIN WMAYOTBBA525 dempeted pm Dd enables RAR pie Sof limite PHP ta Ib MOL WO2002FAEX 0078A0 ur anm Mt WW UU mm li Li Di sein MD en m MWN EOU TAEERA SE 2904 LAA 2207023168 DATE 09 APR 2011 WIC 0 5604 ke DCM ken e TANDC 045A p D T Ghb T1FBA RIN TOM Ug Patesto E1T8DAE 5955185 674414 GETAN Praducl of Palayan A Casada ICEE 003 Glann Ef NHE D23 Casse B RaHs peir O69 69e ge C E munmb A WD Caviar Black Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No A9 of A13 A i LO a d A Ty H l A By ee uU TE ET Tani n FA e ML igi m m NIU
10. after the disturbance ceases and from which the equipment under test recovers its normal performance without operator intervention C Temporary loss of function or degradation of performance the correction of which requires operation intervention D Loss of function or degradation of performance which is not recoverable owing to damage to hardware or software or loss of data aa aaa aaa aaa aaa aaa aaa aaa aasa aaa aa aaa aaa aaa aaa aa aaa a Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 6 of 56 3 Test Configuration of Equipment under Test 3 1 Feature of Equipment under Test Please refer to user s manual 3 2 Test Manner a During testing the interface cables and equipment positions were varied according to Europe Standard EN55022 Class B b The complete test system included remote workstation Monitor Keyboard Mouse Modem Pod Nano Earphone Walk Man eSATA HDD and EUT for EMI test The remote workstation included Notebook c The complete test system included remote workstation Monitor Keyboard Mouse Modem Pod Nano Flash Memory Earphone Walk Man eSATA HDD and EUT for EMS test The remote workstation included Notebook d The test modes of EMI test as follow Test Mode 1 VGA 2048 x 1536 LAN 1Gbps Test Mode 2 VGA 1920 x 1440 LAN 1Gbps Test Mode 3 VGA 640 x 480 LAN 1Gbps For conduction test caused Test Mode 3 generated the w
11. i An executive program x bat under NVR System was executed to read and write data from iPod Nano and eSATA HDD j During the disturbances at telecommunication port test the condition of LAN utilization in excess of 10 MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 7 of 56 3 3 Description of Support Unit EMI l Power Cable Unshielding 1 8m iia 292510 VGA Cable Shielding 1 8m Keyboard DELL SK 8175 USB Cable Shielding 1 85m DELL MOC5UO USB Cable Shielding 1 85m ACEXX DM 1414 RS232 Cable Shielding 1 5m iPod Nano 4 APPLE A1320 USB Cable Shielding 1 0m MIC 4 Audio Cable Unshielding 1 35m Walk Man RQ L8LT Audio Cable Unshielding 1 35m eSATA HDD MY Book 2TB eSATA Cable Shielding 1 0m Remote workstation Notebook 2 SONY VPCEB25FW Power Cable Unshielding 1 8m Use Cable RJ45 Unshielding 15 0m EMS Power Cable Unshielding 1 8m MDADA dd VGA Cable Shielding 1 8m Keyboard DELL SK 8175 USB Cable Shielding 1 85m Mouse DELL MOC5UO USB Cable Shielding 1 85m ACEXX DM 1414 RS232 Cable Shielding 1 5m iPod Nano 2 APPLE A1320 USB Cable Shielding 1 0m Remote workstation Notebook 2 TOSHIBA PSA50T 05M00C Power Cable Unshielding 1 8m Use Cable RJ45 Unshielding 15 0m Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 8 of 56 3 4 General Information of Test Test Site Cer
12. peak method and reported MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 20 of 56 5 3 Typical Test Setup Below 1GHz Test Setup Antenna EN M Equipment under Test AA quip 0 8M 10m Turn Table l Ground Plane Receiver Above 1GHz Test Setup Antenna Equipment under Test REX iu _ penn ES o Turn Table os a Ahsorber Ground Plane 5 4 Measurement Equipment Instrument Manufacturer Model No Serial No Calibration Date Valid Date Bilog Antenna Schaffner CBL6112B 2840 2012 03 23 2013 03 22 Amplifier Agilent 8447D 2944A10593 2012 03 21 2013 03 20 8546A 3807A00454 EMI Receiver HP 85460A 3704A00386 2012 08 22 2013 08 21 Spectrum Analyzer RES FSP40 100047 2012 03 01 2013 02 28 Horn Antenna EMCO 3115 31589 2012 03 01 2013 02 28 Preamplifier Agilent 8449B 3008A01954 2012 02 29 2013 02 28 Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 21 of 56 5 5 Test Result and Data 30MHz 1G Hz AC 230V PollPhase VERTICAL Test Mode 1 VGA 2048 x 1536 LAN 1Gbps Test Date Nov 13 2012 Humidity 5996 30 0 dBuv m LlassB 10m Radiation Margin 6 dB b i 40 1 0 0 30 000 57 50 85 00 112 50 140 00 167 50 135 00 222 50 250 00 305 00 MHz NO Freguency Factor Reading Level imi Margin MHz dB m dBuV dBu m
13. should be at least twice the value of the specified test level g In cases of dispute the test procedure using a step size not exceeding 1 of the start and thereafter 196 of preceding frequency value shall take precedence h Attempts should be made to fully exercise the EUT during testing and to fully interrogate all exercise modes selected for susceptibility i The use of special exercising programs is recommended j Testing shall be performed according to a Test Plan which shall be included in the test report k It may be necessary to carry out some investigatory testing in order to establish some aspects of the test plan 12 2 Test Severity Levels Voltage Level EMF 1V 3 V 10V Specified NOTE xis an open class This level can be specified in the product specification 12 3 Measurement Equipment Model No Serial No Calibration Date Valid Date CS GENERATOR NSG 2070 1059 2012 09 26 2013 09 25 CDN M2 M3 M016 20056 2012 09 26 2013 09 25 T400 19818 2012 09 26 2013 09 25 EM CLAMP Schaffner KEMZ 801 19793 2012 09 26 2013 09 25 Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 48 of 56 12 4 Test Result and Data Final Test Result PASS Pass performance criteria A Required performance criteria A Basic Standard IEC 61000 4 6 Product Standard EN 55024 CDN M3 for AC power ports Coupling mode CDN T400 for Signal Ports
14. 388 5372 7400 2028 oP P 4 250 084 3675 4659 6400 1741 ave F 5 87500 987 4494 sas 7400 1919 GP P e 750 osr 3830 4817 6400 1583 AVG P 7 osso ess orra aros 7400 2639 ap P 8 98380 ess 3177 4165 6400 2235 ave P e 1000 sss 3730 4718 7400 2582 or P m mero oor 3593 4584 7400 2816 OP F 12 sro ssi 2988 3979 6400 2421 Ave P Note Level Reading Factor Margin Level Limit Test engineer aL Me Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 16 of 56 O ae CERPASS TECHNOLOGY CORP Report No TECE1211068 A C C 4 6 Test Photographs of Power Port Front View Rear View Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 17 of 56 as CERPASS TECHNOLOGY CORP Report No TECE1211068 A C 4 7 Test Photographs of Telecommunication Port Rear View MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 18 of 56 5 Test of Radiated Emission 5 1 Test Limit The EUT shall meet the limits of below Table when measured at the measuring distance R in accordance with the methods described in European Standard EN 55022 Clause 10 If the reading on the measuring receiver shows fluctuations close to the limit th
15. 39 gA SESI R S UN ANG A Aa 40 9 5 Test Photographs a aa a any kk a kil a n ai iio aida 41 10 Electrical Fast Transient Burst Immunity TeSt ooooccccnnncccccnncicoccnnoccnnnnrononcnnonnnnancnnnnnnronnnnnnrrnnnnrrrnanannnnos 42 VO o CA oo e ki n an e in ane ON ee ja asye kip jn aa 42 10 2 Test Severity Levels monster ei 42 10 3 Measurement Equipment 1 2 11 2 Aa 42 10 4 Test Result and DAA daa GA nA a AP a Asia 43 KOD TES anode S o ta t a Do mm 44 41 Surge IMMUN T S L k a it ad kind ai fi id tt a il Tm 45 11 1 Test NOCGO UN Citi api 45 11 2 Test Severity ka IA fe pat OC OOOO ap ii a ai ko l an ep no e F POCO kek pt oi n ko ke e 45 11 3 Measurement Equipment 21 Aa 46 11 4 TestResult and Dala AA 46 MUS MSE TOTO t CENE 47 12 Conduction Disturbances induced by Radio Frequency Fields ccconnncconnnccccononcccoccncononnanonnnancnnnnos 48 A lo lli TETTE A mmn 48 12 2 Test severity LENG MM mm 48 12 3 Measurement EqQuipme nt ccccccccceecceeceseeeeeeeeseeeeseeeeeeeeeseeeese nnn nnne nne nnne s rsa nns na nsus rss rsen kanya 48 124 Test c ANE DAA eee ki 49 le TeS MOLO GED MED 50 13 Power Frequency Magnetic Field Immunity TeSt ooncconnncconncicocncccncaconnnoronnnononanrnnnnrrnnnnrrnnnnrrnannrrnaannrnnans 51 A A m 51 13 2 Test Severity LEvelS A dap Bo try b da ap bete kahaba TAU
16. 4527 2476 3000 524 GP 4 o P 2 1223500 1274 3790 2516 3000 484 ap 40 o P 3 190 1760 1326 3500 2254 3000 746 OP 40 O 4 175 2000 1464 3899 2435 3000 565 aP 4 0 P e 265 0500 075 3669 2596 3700 31M ap 40 o P Note Level Reading Factor Margin Level Limit MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 24 of 56 C us CERPASS TECHNOLOGY CORP Report No TECE1211068 A AC 230V Pol Phase HORIZONTAL Test Mode 1 VGA 2048 x 1536 LAN 1Gbps Test Date Nov 13 2012 Humidity 80 0 dBuV m 40 ElassH Him Radiation 12 3 5 Hargin 6 d i 0 0 300 000 370 00 440 00 510 00 580 00 650 00 720 00 790 00 860 00 1000 00 MHz MHz dB m dBuV dBuV m dBuV m cm E BRE 3I 7E AR a te EXEC BE AK IR 3E 10 AA EMI s ser 3000 733 3858 3122 aroo 578 aP 100 o P 4 48000 573 3562 2889 3700 ar ap 100 o P 6 s000000 484 3604 3120 3700 580 ap 100 o P 6 7144000 307 2868 2561 3700 1139 aP 100 0 JP 7 8005000 214 3057 2843 3700 857 QP 100 o P Note Level Reading Factor Margin Level Limit VAN Test engineer Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 25 of 56 5 6 Test Result and Data 1
17. 6 of 56 es CERPASS TECHNOLOGY CORP Report No TECE1211068 A C Appendix A Photographs of EUT Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No A1 of A13 e e CERPASS TECHNOLOGY CORP Report No TECE1211068 A C C Cerpass Technology Corp Tel 886 2 2655 8100 Fax 886 2 2655 8200 2 1 ese ese e tH ri YA qe go HH 96090 s3333 es Jun 11 2013 A2 of A13 Issued Date Page No Report No TECE1211068 A C C S us CERPASS TECHNOLOGY CORP En AA li a ai L DU innit w 1 PAGAN nnm Im ru MAMMA in d IN f V n S i j Wel A INR in las bd Jun 11 2013 Issued Date A3 of A13 Page No Cerpass Technology Corp Tel 886 2 2655 8100 Fax 886 2 2655 8200 o CE e W CERPASS TECHNOLOGY CORP ReportNo TECE1211068 A Nu Nu ki LL Mi E Lui p MERO i dit PATA pu Mit ue I T TT T NT E TIT AUN A h HAL TU ft n NG i ap zw p ae ma peur MED n sga vigo Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No A4 of A13 Oo 0000000000000 idi I Hh TEIE iiu pr A ii Hee _ pe I pne 1 CERPASS TECHNOLOGY CORP Report No TECE1211068 A an ans 8 a 5 TELE J T El
18. 99 0200 4298 7400 3102 op P io 152940 Gao ass area 6400 2647 avo F Ca ensten sr 3142 4173 7400 3227 op P Note Level Reading Factor Margin Level Limit Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 14 of 56 Test Mode 5 VGA 2048 x 1536 ISN LAN 2 100Mbps Humidity Test Date Nov 13 2012 100 0 dBuY ISH CLASS B OP ISN CLASS B AYG MHz 5 30 000 0 5 Frequency Factor Reading Level Limit Margin MHz dBuV dBuV dBuV dB Detector er C Ga 0 NIDA O 4 d gt l 63 I mp JI 0619 a iras 7002 sas 74055 6400 2 a 2419 15 i 19 15 1 gg C c JI C Qu 18 k g O T 1 B 11 12 co I JI C 23 1299 10 40 64 00 12 Note Level Reading Factor Margin Level Limit 8 Li Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 15 of 56 O CERPASS TECHNOLOGY CORP Report No TECE1211068 A C Test Mode 6 VGA 2048 x 1536 ISN LAN 2 10Mbps Humidity Test Date Nov 13 2012 100 0 dBuY ISN CLASS B OP ISN CLA55 B AVG 0 150 MHz 5 30 000 onus i Level Limit MHz dB dBuV dBuV dBuV pr 1 9 83 28 66 3551 QP EXE AE EE 3E 32 3 RE 10 3 2500 984 4
19. EMC TEST REPORT According to EN 55022 2010 Class B EN 55024 2010 ASI NZS CISPR22 2009 Class B IEC 61000 4 2 2008 EN 61000 3 2 2006 A1 2009 A2 2009 IEC 61000 4 3 2006 A1 2007 A2 2010 EN 61000 3 3 2008 IEC 61000 4 4 2004 A1 2010 IEC 61000 4 5 2005 IEC 61000 4 6 2008 IEC 61000 4 8 2009 IEC 61000 4 11 2004 Applicant VIVOTEK INC 6F No 192 Lien Cheng Rd Chung Ho ne New Taipei City 235 Taiwan R O C Equipment Network Video Recorder Model No ND8401 Trade Name VIVOTEK The test result refers exclusively to the test presented test model sample Without written approval of Cerpass Technology Corp the test report shall not be reproduced except in full This test report is only applicable to European Community MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 1 of 56 Se cf tU CERPASS TECHNOLOGY CORP Report No TECE1211068 A Contents CERTIFICATE OF COMPLIANCE aNG adokte p nee red se bin rosita p k YON di do GA AN 5 1 Summary of Test Procedure and Test Results 11 02020000700 aaaaaaaanananannasaaanananananannanannasaaannnsaaaan 6 2 Immunity Testing Performance Criteria Definition oonnccccnnnnccccnnnncccocancnoncncrnnnnnnconnnnnrononnnnrrnnnnnrrrnanarenos 6 3 Test Configuration of Equipment under Test 2 21 202444 ama 7 3 1 Feature of Equipment under TeSt occccccccccccnnccccnccocnnccononon
20. ESQ NSG3060 TESQ NSG3060 1385 2012 07 03 2013 07 02 11 4 Test Result and Data Final Test Result PASS Pass performance criteria LA Required performance criteria B Basic Standard IEC 61000 4 5 Product Standard EN 55024 Test Voltage Input AC Power Port 0 5 kV 1 0 kV 2 0 kV Temperature 23 C Relative Humidity 49 Atmospheric Pressure 1011 hPa Test Date Sep 12 2012 Power Port Waveform 1 2 50us 8 20us Repetition rate 60 sec Time 5 time each condition Phase Voltage Mode Polarity Result LA CIS 0 5 kV 1 0kV A SES Note A means the EUT function is normal working during the test Signal Port RJ45 The ports of EUT which according to the manufacturer s specification can not connect directly to outdoor Test engineer aa aaa aaa aaa aaa aaa aaa aaa aasa aaa aa aaa aaa aaa aaa aa aaa a Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 46 of 56 ka e C w CERPASS TECHNOLOGY CORP Report No TECE1211068 A 11 5 Test Photographs i ef Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 47 of 56 12 Conduction Disturbances induced by Radio Frequency Fields 12 1 Test Procedure a The EUT shall be operated within its intended climatic conditions The temperature and relative humidity should be recorded b This test method test can be performed without us
21. GHz 6GHz AC 230V PollPhase VERTICAL Test Mode 1 VGA 2048 x 1536 LAN 1Gbps Test Date Nov 13 2012 Humidity 5796 972 0 dBuY m LL Lo Lo ln Class B PEAK 1 Class B AYG 5 49 7 A 0 0 1000 000 1500 00 2000 00 2500 00 3000 00 3500 00 4000 00 4500 00 5000 00 6000 00 MHz N Frequency Factor Reading Level Limit Margin Detect Height Azimuth DIF a MHz dB m dBuV dBuV m dBuV m dB m s 1400000 zo 6250 4558 7000 2442 peak 200 755000 454 5082 4568 7000 24G2 peak 400 6 a IG 2000000 330 6762 6432 7000 1568 peak 200 1 f 20 20 40 40 20 93 20 93 P a 2660 00 La Note Level Reading Factor Margin Level Limit e 0 0 papa eak 0 EI V 0 ES e 0 t EX KO MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 26 of 56 AC 230V Pol Phase HORIZONTAL Test Mode 1 VGA 2048 x 1536 LAN 1Gbps Test Date Nov 13 2012 Humidity 57 97 0 dBu m Class B PEAK 7 M Class B AV 49 l 0 0 1000 000 1500 00 2000 00 2500 00 3000 00 3500 00 4000 00 4500 00 5000 00 6000 00 MHz a Frequency Factor Reading Level Limit Margin Height Azimuth gt in dBuV dBuV m dBuV m dB em EF fo Note Level Reading Factor Margin Level Limit A A L LA NG Test enginee
22. VA Power Factor 0 777 Load Current 0 30 to 0 33 Arms 0 60 Apk Crest Factor 1 762 Voltage Variations Highest Half cycle level 1 91 Lowest Half cycle level 41 29 d max 0 623 Pass Number of Change Intervals 6 Highest d t for 500 ms 0 00 Pass Longest d t over 3 30 0 02 seconds Steady State definition gt 1000 ms below 0 32 Highest Steady State level 1 585 Lowest Steady State level 1 57 max d c between adjacent 0 01 Pass max d c between any 0 01 Flicker Long term Flicker indicator Plt 0 22 Short term Flicker indicator Pst Plt Interval Pst E 0 23 za 0 23 3 0 23 4 0 23 5 0 23 6 0 23 7 0 23 B 0 23 9 0 23 10 0 22 il 0 22 12 0 22 Pat classifier Duration Flicker 0 1 0 12 0 7 0 11 1 0 0 11 1 5 Dll 2 25 0 10 3 0 10 45 0 10 65 0 10 8 0 09 10 0 09 13 0 09 17 0 09 30 0 09 50 0 09 80 0 08 Test engineer 0 UN 776 Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 32 of 56 LO CE a CERPASS TECHNOLOGY CORP Report No TECE1211068 A 7 4 Test Photographs MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 33 of 56 8 Electrostatic Discharge Immunity Test 8 1 Test Procedure a In the case of air discharge testing the
23. ach of the lines and earth if there is no other specification f The test procedure shall also consider the non linear current voltage characteristics of the equipment under test Therefore the test voltage has to be increased by steps up to the test level specified in the product standard or test plan g Alllower levels including the selected test level shall be satisfied For testing the secondary protection the output voltage of the generator shall be increased up to the worst case voltage breakdown level let through level of the primary protection h If the actual operating signal sources are not available that may be simulated Under no circumstances may the test level exceed the product specification The test shall be carried out according to a test plan i To find all critical points of the duty cycle of the equipment a sufficient number of positive and negative test pulses shall be applied For acceptance test previously unstressed equipment shall be used to the protection devices shall be replaced 11 2 Test Severity Level Open circuit test voltage 10 KV 4 X Specified NOTE X is an open class This level can be specified in the product specification Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 45 of 56 o CERPASS TECHNOLOGY CORP Report No TECE1211068 A C 11 3 Measurement Equipment Model No Calibration Date Valid Date T
24. chnology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 12 of 56 AC 230V PollPhase NEUTRAL Test Mode3 VGA 640 x 480 LAN 1Gbps Test Date Nov 13 2012 Humidity 100 0 dBuY Class B Conduction GP Class B Conduction AV G 50 BAINA tw WA ha 0 150 05 MHz 5 30 000 Frequency Factor Reading Level Limit Margin Ji aj MHZ dBuV dBuV dBuV dB Detector PI 0 6660 40 07 4023 46 00 ANG 0 17 0 7340 46 00 ANG 3 5860 36 13 46 00 9 87 AVG 38 15 46 00 AVG Note Level Reading Factor Margin Level Limit 9 8 198 KAI KAI Da c5 co Oo e i 0 0 0 0 Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 13 of 56 CERPASS TECHNOLOGY CORP Report No TECE1211068 A C 4 5 2 Conducted Emission for Telecommunication Port Test Data Test Mode 2 VGA 2048 x 1536 ISN LAN 2 1Gbps Humidity Test Date Nov 13 2012 100 0 dBuY ISN CLASS B BP ISN CLASS B AYG 0150 MHz 30 000 Tas NECEM IRL ERE HR AE AE ee E OG L3 rss ssi so anon 7406 azo ak F 4 18020 952 2060 3942 6400 255 avo P s somo ear orsa arar 1400 3280 GP F Ls ess ser 2n 0001 vem roo ave e r maz esr s337 a328 7400 3072 OP Ls p nam esi aros p srsr e400 ann Ave Te e 12 40 s
25. climatic conditions shall be within the following ranges e ambient temperature 15 C to 35C e relative humidity 30 to 60 e atmospheric pressure 86 KPa 860 mbar to 106 KPa 1060 mbar b Test programs and software shall be chosen so as to exercise all normal modes of operation of the EUT The use of special exercising software is encouraged but permitted only where it can be shown that the EUT is being comprehensively exercised C The test voltage shall be increased from the minimum to the selected test severity level in order to determine any threshold of failure The final severity level should not exceed the product specification value in order to avoid damage to the equipment d The test shall be performed with both air discharge and contact discharge On reselected points at least 10 single discharges in the most sensitive polarity shall be applied on air discharge On reselected points at least 25 single discharges in the most sensitive polarity shall be applied on contact discharge e For the time interval between successive single discharges an initial value of one second is recommended Longer intervals may be necessary to determine whether a system failure has occurred f In the case of contact discharges the tip of the discharge electrode shall touch the EUT before the discharge switch is operated g In the case of painted surface covering a conducting substrate the following procedure shall be adopted e If th
26. cording to the methods defined in European Standard EN 55022 The EUT was placed on a nonmetallic stand in a shielded room 0 8 meters above the ground plane as shown in section 4 2 The interface cables and equipment positioning were varied within limits of reasonable applications to determine the position producing maximum conducted emissions Table 1 Class B Line Conducted Emission Limits Frequency range Limits dB p V MHz Quasi Peak 0 15 to 0 50 66 to 56 56 to 46 0 50 to 5 56 5 to 30 Note 1 The lower limits shall apply at the transition frequencies Note 2 The limit decreases linearly with the logarithm of the frequency in the range 0 15 MHz to 50MHz Table 2 Limits of conducted common mode asymmetric mode disturbance at telecommunication ports in the frequency range 0 15 MHz to 30 MHz for class B equipment Frequency Voltage limits Current limits range dB u V dB yA MHz 0 15 to 0 5 84 to 74 74 to 64 40 to 30 30 to 20 0 5 to 30 Note 1 The limits decrease linearly with the logarithm of the frequency in the range 0 15 to 0 5 MHz Note 2 The current and voltage disturbance limits are derived for use with an impedance stabilization network ISN which presents a common mode asymmetric mode impedance of 150 to the telecommunication under test conversion factor is 20 log10 150 1 44dB MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 10 o
27. d generated by the bucolical antenna necessitates testing each position twice once with the antenna positioned vertically and again with the antenna positioned horizontally The circular polarization of the field from the log spiral antenna makes a change of position of the antenna unnecessary d At each of the above conditions the frequency range is swept 80 1000 MHz pausing to adjust the R F signal level or to switch oscillators and antenna The rate of sweep is in the order of 1 5 10 3 decades s The sensitive frequencies or frequencies of dominant interest may be discretely analyzed 9 2 Test Severity Levels Frequency Band 80 1000 MHz Test field strength V m Specified Remark X is an open class 9 3 Measurement Equipment Amplifiers 80 1000MHz 100W SCHAFFNER CBA9413B 43510 N A N A Amplifiers 80 3000MHz 20W SCHAFFNER CBA9428 43515 SCHAFFNER SCHAFFNER CBL6141A 4257 4231A01 115002 2012 00 28 201310925 Field Probe HOLADAY HI 6105 00144727 2012 09 20 2013 09 19 Signal Generator 8648B 3629U00612 2012 09 26 2013 09 25 51011 EMC 33312 2012 09 26 2013 09 25 Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 39 of 56 9 4 Test Result and Data Final Test Result PASS Pass performance criteria LA Required performance criteria A Basic Standard IEC 61000 4 3 Product Standard EN 55024 Frequency Range 80 1000 MHz T
28. der Model No ND8401 HEREBY CERTIFY THAT The measurements shown in this test report were made in accordance with the procedures given in EUROPEAN COUNCIL DIRECTIVE 2004 108 EC The test was carried out on Nov 14 2012 at Cerpass Technology Corp Signature m Hill Chen EMC RF B U Assistant Manager MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No o of 56 1 Summary of Test Procedure and Test Results Test ltem Normative References Test Result EN 55022 2010 Conducted Emission PASS AS NZS CISPR22 2009 EN 55022 2010 Radiated Emission PASS AS NZS CISPR22 2009 Voltage Fluctuations EN 61000 3 3 2008 PASS Electrostatic Discharge Immunity IEC 61000 4 2 2008 PASS Test ESD Radio Frequency electromagnetic IEC 61000 4 3 2006 A1 2007 A2 2010 PASS field immunity test RS Electrical Fast Transient Burst IEC 61000 4 4 2004 A1 2010 PASS Immunity Test EFT Surge Immunity Test IEC 61000 4 5 2005 PASS Conduction Disturbances induced by IEC 61000 4 6 2008 PASS Radio Frequency Fields Power Frequency Magnetic Field IEC 61000 4 8 2009 PASS Immunity Test Voltage Dips and Voltage IEC 61000 4 11 2004 PASS Interruptions Immunity Test 2 Immunity Testing Performance Criteria Definition A Normal performance within limits specified by the manufacture requestor or purchaser B Temporary loss of function or degradation of performance which ceases
29. e coating is not declared to be an insulating coating by the equipment manufacturer then the pointed tip of the generator shall penetrate the coating so as to make contact with the conducting substrate Coating declared as insulating by the manufacturer shall only be submitted to the air discharge The contact discharge test shall not be applied to such surfaces h In the case of air discharges the round discharge tip of the discharge electrode shall be approached as fast as possible without causing mechanical damage to touch the EUT After each discharge the ESD generator discharge electrode shall be removed from the EUT The generator is then retriggered for a new single discharge This procedure shall be repeated until the discharges are completed In the case of an air discharge test the discharge switch which is used for contact discharge shall be closed MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 34 of 56 8 2 Test Setup for Tests Performed in Laboratory Table Size 1 6LX0 8WX0 8H m gt The test setup consists of the test generator EUT and auxiliary instrumentation necessary to perform DIRECT and INDIRECT application of discharges to the EUT as applicable in the follow manner a Contact Discharge to the conductive surfaces and to coupling plane b Air Discharge at insulating surfaces The preferred test method is that of type tests perfo
30. e reading shall be observed for at least 15 s at each measurement frequency the highest reading shall be recorded with the exception of any brief isolated high reading which shall be ignored Table Limits for radiated disturbance of class B ITE at a measuring distance of 10 m Frequency range Quasi peak limits MHz dB uV m 30 to 230 230 to 1000 NOTE 1 The lower limit shall apply at the transition frequency NOTE 2 Additional provisions may be required for cases where interference occurs The EUT shall meet the limits of below Table when measured in accordance with the method described in European Standard EN 55022 Clause 10 and the conditional testing procedure described below Table Limits for radiated disturbance of class B ITE at a measuring distance of 3 m Frequency range Average limit Peak limits GHz dB uV m dB uV m 0 NOTE The lower limit applies at the transition frequency Conditional testing procedure The highest internal source of an EUT is defined as the highest frequency generated or used within the EUT or on which the EUT operates or tunes If the highest frequency of the internal sources of the EUT is less than 108 MHz the measurement shall only be made up to 1 GHZ If the highest frequency of the internal sources of the EUT is between 108 MHz and 500 MHz the measurement shall only be made up to 2 GHz If the highest frequency of the internal sources of the EUT is between 500 MHz and 1 GHz t
31. emperature 21 C Relative Humidity 62 Atmospheric Pressure 1011 hPa Test Date Sep 19 2012 Modulation AM 80 1KHz sine wave Dwell time 2 9 S Frequency Step Size 1 9o of preceding frequency value romo Vea Rear Sm A 99 vena Rem avm A 100 Horizontal Front vm A 100 Horizontal Rear ovm A 00 orena Rig ovm A Note A means the EUT function is normal working during the test Test engineer MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 40 of 56 C ae CERPASS TECHNOLOGY CORP Report No TECE1211068 A 9 5 Test Photographs MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 41 of 56 10 Electrical Fast Transient Burst Immunity Test 10 1 Test Procedure a In order to minimize the effect of environmental parameters on test results the climatic conditions when test is carrying out shall comply with the following requirements e ambient temperature 15 C to 35 C e relative humidity 45 to 7596 e Atmospheric pressure 86 Kpa 860 mbar to 106 Kpa 1060 mbar b In order to minimize the effect of environmental parameters on test results the electromagnetic environment of the laboratory shall not influence the test results c The variety and diversity of equipment and systems to be tested make it difficult t
32. f 56 4 2 Test Procedures a The EUT was placed on a desk 0 8 meters height from the metal ground plane and 0 4 meter from the conducting wall of the shielding room and it was kept at least 0 8 meters from any other grounded conducting surface Connect EUT to the power mains through a line impedance stabilization network LISN All the support units are connecting to the other LISN The LISN provides 50 ohm coupling impedance for the measuring instrument The CISPR states that a 50 ohm 50 micro Henry LISN should be used Both sides of AC line were checked for maximum conducted interference The frequency range from 150 kHz to 30 MHz was searched Set the test receiver system to Peak Detect Function and Specified Bandwidth with Maximum Hold Mode TO sa apo 4 3 Typical Test Setup Manufacturer Valid Date Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 11 of 56 4 5 Test Result and Data 4 5 1 Conducted Emission for Power Port Test Data Power AC 230V PollPhase LINE Test Mode3 VGA 640 x 480 LAN 1Gbps Test Date Nov 13 2012 Humidity 100 0 dBuY Class B Conduction HP Class B Conduction A Vv Gi 50 0150 0 5 MHz 5 30 000 Frequency evel Limit MHz dB dBuV dBuV dBuV dB 0 0 7340 A 1 J 3 11 39 Note Level Reading Factor Margin Level Limit 6 G D D o CO Cerpass Te
33. he measurement shall only be made up to 5 GHz If the highest frequency of the internal sources of the EUT is above 1 GHz the measurement shall be made up to 5 times the highest frequency or 6 GHz whichever is less MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 19 of 56 5 2 Test Procedures a The EUT was placed on a rotatable table top 0 8 meter above ground b The EUT was set 3 10 meters from the interference receiving antenna which was mounted on the top of a variable height antenna tower The table was rotated 360 degrees to determine the position of the highest radiation The antenna is a half wave dipole and its height is varied between one meter and four meters above ground to find the maximum value of the field strength both horizontal polarization and vertical polarization of the antenna are set to make the measurement e For each suspected emission the EUT was arranged to its worst case and then tune the antenna tower from 1 M to 4 M and turn table from O degree to 360 degrees to find the maximum reading f Set the test receiver system to Peak Detect Function and specified bandwidth with Maximum Hold Mode g Ifthe emission level of the EUT in peak mode was 3 dB lower than the limit specified then testing will be stopped and peak values of EUT will be reported otherwise the emissions which do not have 3 dB margin will be repeated one by one using the quasi
34. ing a sell shielded enclosure This is because the disturbance levels applied and the geometry of the setups are not likely to radiated a high amount of energy especially at the lower frequencies If under certain circumstances the radiated energy is too high a shielded enclosure has to be used C The test shall be performed with the test generator connected to each of the coupling and decoupling devices in turn while the other non excited RF input ports of the coupling devices are terminated by a 50 ohm load resistor d The frequency range is swept from 150 KHz to 80 MHz using the signal levels established during the setting process and with the disturbance signal 80 amplitude modulated with a 1KHz sign wave pausing to adjust the RF signal level or to switch coupling devices as necessary The rate of sweep shall no exceed 1 5 x 10 decades s Where the frequency is swept incrementally the step size shall no exceed 196 of the start and thereafter 196 of the preceding frequency value e The dwell time at each frequency shall not be less than the time necessary for the EUT to be exercised and able to respond Sensitive frequencies e g clock frequency ies and harmonics or frequencies of dominant interest shall be analyzed separately f An alternative test procedure may be adopted wherein the frequency range is swept incrementally with a step size not exceeding 4 of the start ad thereafter 4 of the preceding frequency value The test level
35. kawawa 51 15 5 Measurement EQUIPOS derivaciones rei 51 ISA TOS Sb Lalo BEE tiesto AA 52 13 5 Test Photographs iv ia 53 14 Voltage Dips and Voltage Interruptions Immunity Test Setup oocccconnnicconccccconconccnnnanonnnnanonnnnanennnananenos 54 nn m 54 14 2 Measurement EquIpMeNt ccoocccccnconcnncnccononccnnnccnnnononnononnnnnnnnnnnnnnnnnnnnnnnnennnnnnnnnennnnnnnnnnnnnenannenannnnas o4 14 3 Test Result AMONI A AN T eh e o 55 14 OGL nee TON NRI TT UU UU Nm o6 Appendix A Photographs of BUT 566 risi ti sofane kk da SD kk n nunu nana a ik EP l n Ga Et nuna A1 A13 MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 3 of 56 History of this test report ORIGINAL M Additional attachment as following record TECE1211068 A Jun 11 2013 Replace another new one SATA board Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 4 of 56 CERTIFICATE OF COMPLIANCE According to EN 55022 2010 Class B EN 55024 2010 AS NZS CISPR22 2009 Class B IEC 61000 4 2 2008 EN 61000 3 2 2006 A1 2009 A2 2009 IEC 61000 4 3 2006 A1 2007 A2 2010 EN 61000 3 3 2008 IEC 61000 4 4 2004 A1 2010 IEC 61000 4 5 2005 IEC 61000 4 6 2008 IEC 61000 4 8 2009 IEC 61000 4 11 2004 Applicant VIVOTEK INC 6F No 192 Lien Cheng Rd Chung Ho nn New Taipei City 235 Taiwan R O C Equipment Network Video Recor
36. n open level The level is subject to negotiation between the user and manufacturer or is specified by the manufacturer 10 3 Measurement Equipment Model No Calibration Date Valid Date TESQ NSG3060 NSG3060 1385 2012 07 03 2013 07 02 Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 42 of 56 10 4 Test Result and Data Final Test Result PASS Pass performance criteria LA Required performance criteria B Basic Standard IEC 61000 4 4 Product Standard EN 55024 On Power Supply 0 5 KV 1 0 KV TE On Signal Port 0 5 KV Temperature 23 Q Relative Humidity 49 Atmospheric Pressure 1011 hPa Test Date Sep 12 2012 Pulse 5 50 ns Repetition Rate Burst 15m 300ms 9 kHz below and equal 2 0 kV Test time 1 min each condition 0 5 kV 1 0 kV Voltage Mode Polarity Result Phase A A A A N A A A A L N A A A A Power Line PE A A A A L PE A A A A N PE A A A A L N PE A A A A Signal Line RJ45 10M 100M 1G A A Note A Means the EUT function is normal working during the test Test engineer i ii Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 43 of 56 a CERPASS TECHNOLOGY CORP Report No TECE1211068 A C C 10 5 Test Photographs Main Clamp Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100
37. o establish general criteria for the evaluation of the effects of fast transients bursts on equipment and systems d Test on Power Line e The EFT B generator was located on the GRP The length from the EFT B generator to the EUT is not exceeding 1 m e The EFT B generator provides the ability to apply the test voltage in a non symmetrical condition to the power supply input terminals of the EUT e Test on Communication Lines he coupling clamp is composed of a clamp unit for housing the cable length more than 3 m and was placed on the GRP he coupling clamp provides the ability of coupling the fast transient bursts to the cable under test f The test results may be classified on the basic of the operating conditions and the functional specification of the equipment under test according to the following performance criteria Normal performance within the specification limits e Temporary degradation or loss of function or performance which is self recoverable e Temporary degradation or loss of function or performance which requires operator intervention or system reset e Degradation or loss of function which is not recoverable due to damage of equipment components 10 2 Test Severity Levels The following test severity levels are recommended for the fast transient burst test Open circuit output test voltage 10 On Power Supply On I O signal data and control line Od 0 5 KV 0 25 KV 1 2 Remark X is a
38. ographs 1 G A ZO GFIZ kore se il ori a ls Gua ANAN a etant niit ert n 29 e AM NAA A an AA 30 6 1 Limits of Harmonics Current Measurement occcccocnnccccncccccncconnncnonnnnnnnnnonnnnnnnnnnononnnonnnnononnnenanininos 30 0 2 SSS SU zz op BI 30 ee Fluctuations e 31 lla PESTE TOCOQUIS AA E AP 31 7 2 Measurement Equipment ccccccccceccsececeeeeseeeseeeeae cess eeseeeeseeeeseeeeseeseeeseeeseueeseeessueeseeeesusesaes 31 ld Test Res lt ANG lados ee en ee ene nee a 32 A WEST roe ODINS AA mm 33 8 Electrostatic Discharge Immunity TeSt csceeeeeeeeeeeeeeeeeeeeeeeeeeeseeeeeseeseeeeseeneseeaeeeeneseeneeseeneessonaenes 34 8 1 TestProcedulG ROTEN 34 8 2 Test Setup for Tests Performed in Laboratory wanunua nanunua 35 A AA A 36 5 4 Measurement EQUIDIYIGIM IA 36 8 9 Test Result and Data occcocccconnccocnccccnccncnconnnnnnnconnnonnnnnnnnnnnrnnnnrnnnnnnnnnnnnrnnnnrnnnnnnnnnnnnnnnnnnnnrnarinnnninos 37 8 ESPADAS MET RE 38 9 Radio Frequency electromagnetic field immunity teSt ooccconnnnicconocicoccnccccnnanonnnnnnrononnnnonnnnnnronnanarennannos 39 Silo o AMA AMA Wa 39 aa aaa aaa aaa aaa aaa aasam aaa aaa aaa ip Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 2 of 56 e cf tU CERPASS TECHNOLOGY CORP Report No TECE1211068 A 9 2 o Ic A An nn 39 9 9 Measurement EGU PAS TA n st e ks t ab e ad
39. onnnonannnnonnnnnnnnononnnonannnnnannnnnnnnononnncnnanos 7 Bi PP o 7 Su Descriptor SAN PON ke ANT fit eta ni ka ate ri et l tf batista 8 3 4 General Information of Test coooncccccnnncccnnncocnnnoconoconnncnonnnonnnnnonnnnnonnnnnonnnnnnnnnnnnnnnnnnnnnnnnnnenonenenonos 9 3 5 Measurement Uncertainty nauza nasaneza 9 4 Test of Conducted EMISSION oonncccncnccccnnconcncccncncocnncnnnnnronnnn ron aaa aa saaa aaaataosettsoseroseseronosoranssouvoososonosanonn 10 PA e a n ak e n ek e a a kk a ek a ek n n at a t GA 10 de TEST OCOOUFE iii T 11 Ad e T SE SOU AA AA AA 11 44 M asurement EQUDMEN e kone ANAND e ek tt e ANA abo ep EU Dd NM EE 11 Ao EST ROS UNINC LI oper ae ORO a a ip pp E AA AA 12 4 6 Test Photographs of Power Port 1 1 nennen nnne nennen nnns nnne nna nnn nis 17 4 7 Test Photographs of Telecommunication POlt cccoooncnccconnnncccocnnnonoccnnonnnnononnnnnnononnnnnnonnnnnnnnnnnnononens 18 5 Test of Radiated Emission 1 an 19 als d Eli odiarte M 19 92 o 6 ONERE 20 5 3 Typical Test Setup oo cre been bana e bare bana ptit be koi ka de a atik fast pro pete fe ken kata linet Una 21 ux Mean ANA st k po pe n ro a e it l on za dele sea dos 21 5 5 Test Result and Data 3OMAZ TGHZ Lescano 22 5 6 Test Result and Data 1GHz 6GH7 a 26 5 7 Test Photographs 30MA241GHZ iaasa dita ord Sud rtt a ta 28 5 5 Test Pliot
40. orst test result it was reported as final data For radiation test caused Test Mode 1 generated the worst test result it was reported as final data e The test modes of disturbances at telecommunication ports test as follow Test Mode 1 VGA 2048 x 1536 ISN LAN 1 1Gbps Test Mode 2 VGA 2048 x 1536 ISN LAN 2 1Gbps Test Mode 3 VGA 1920 x 1440 ISN LAN 2 1Gbps Test Mode 4 VGA 640 x 480 ISN LAN 2 1Gbps Test Mode 5 VGA 2048 x 1536 ISN LAN 2 100Mbps Test Mode 6 VGA 2048 x 1536 ISN LAN 2 10Mbps caused Test Mode 2 amp Test Mode 5 Test Mode 6 generated the worst test result they were reported as final data f An executive program WINFCC EXE under NVR System which generates a complete line of continuously repeating H pattern was used as the test software The program was executed as follows 1 Turn on the power of all equipment 2 The PC reads the test program from the hard disk drive and runs it 3 The PC sends H messages to the EUT and the EUT displays H patterns on the screen 4 The PC sends H messages to the internal Hard Disk and the Hard Disk reads and writes the message 5 The PC sends H messages to the modem 6 Repeat the steps from 2 to 5 g An executive program COLOR BAR EXE under NVR System was executed to play 1kHz audio h An executive program PING EXE under NVR System was executed to transmit and receive data to the remote workstation through LAN
41. pass Technology Corp 2F 11 No 3 Yuan Qu St Nankang Software Park Taipei Taiwan 115 R O C Test Site Location No 68 1 Shihbachongsi Shihding Township OATS2 SD Taipei City 223 Taiwan R O C FCC Registration Number TW1049 TW1061 488071 390316 IC Registration Number 4934B 1 4934D 1 T 1173 for Telecommunication Test C 4139 for Conducted emission test R 3428 for Radiated emission test G 97 for radiated disturbance above 1GHZ Frequency Range Conducted Emission Test from 150 kHz to 30 MHZ Investigated Radiated Emission Test from 30 MHz to 6 000 MHz The test distance of radiated emission below 1GHz from antenna to EUT is 10 M The test distance of radiated emission above 1GHz from antenna to EUT is 3 M Car Laboratory Accreditation INI W IN Testing Laboratory VCCI Registration Number Test Distance 1439 NVLAP LAB CODE 200954 0 3 5 Measurement Uncertainty Measurement Item Measurement Frequency Polarization Uncertainty Conducted Emission 9 kHz 30 MHz LINE NEUTRAL 3 25 dB 30 MHz 1 000 MHz Vertical Horizontal 3 93 dB Radiated Emission l 1 000 MHz 18 000 MHz Vertical Horizontal 5 18 dB MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 9 of 56 4 Test of Conducted Emission 4 1 Test Limit Conducted Emissions were measured from 150 kHz to 30 MHz with a bandwidth of 9 kHz and return leads of the EUT ac
42. r AAA MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 27 of 56 gt a CERPASS TECHNOLOGY CORP Report No TECE1211068 A C C 5 7 Test Photographs 30MHz 1GHz Front View Rear View Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 28 of 56 am E CERPASS TECHNOLOGY CORP Report No TECE1211068 A C 5 8 Test Photographs 1GHz 6GHz E CCT aut y EEB IK Front View Rear View Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 29 of 56 6 Harmonics Test 6 1 Limits of Harmonics Current Measurement Limits for Class A equipment Limits for Class D equipment Harmonics Max Permissible Harmonics Max Permissible Max Permissible Order harmonics Order harmonics current per harmonics current n current n watt mA W A A 5 9 05 040 9 04 6 030 1 ClassA and Class D are classified according to item section 5 of EN 61000 3 2 2006 A1 2009 A2 2009 2 According go section 7 of EN 61000 3 2 2006 A1 2009 A2 2009 the above limits for all equipment except for lighting equipment are for all applications having an active input power 75 W and no limits apply for equipment with an active input power up to and including 75 W 6 2 Test Result and Data As specified on clause
43. rmed in laboratories and the only accepted method of demonstrating conformance with this standard The EUT was arranged as closely as possible to arrangement in final installed conditions A ground reference plane was provided on the floor of the test site It was a metallic sheet copper or aluminum of 0 25 mm minimum thickness other metallic may be used but they shall have at least 0 65 mm thickness In the Cerpass Technology Corp we provided 1 mm thickness stainless steel ground reference plane The minimum size of the ground reference plane is 2 5 m x 2 5 m the exact size depending on the dimensions of the EUT It was connected to the protective grounding system The EUT was arranged and connected according to its functional requirements A distance of 1m minimum was provided between the EUT and the wall of the lab and any other metallic structure In cases where this length exceeds the length necessary to apply the discharges to the selected points the excess length shall where possible be placed non inductively off the ground reference plane and shall not come closer than 0 2m to other conductive parts in the test setup Where the EUT is installed on a metal table the table was connected to the reference plane via a cable with a 470k ohm resister located at each end to prevent a build up of charge The test setup was consist a wooden table 0 8m high standing on the ground reference plane A HCP 1 6 m x 0 8 m was placed on the table
44. rt A A A A A A RS232 Port A A A A A A VGA Port A A A A A A Audio Port A A A A A A eSATA Port A A A A A A Note A means the EUT function is normal working during the test Test engineer i ef Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 37 of 56 ny CE a CERPASS TECHNOLOGY CORP Report No TECE1211068 A 8 6 Test Photographs MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 38 of 56 9 Radio Frequency electromagnetic field immunity test 9 1 Test Procedure a The equipment to be tested is placed in the center of the enclosure on a wooden table The equipment is then connected to power and signal leads according to pertinent installation instructions b The antenna which is enabling the complete frequency range of 80 1000 MHz is placed 3m away from the equipment The required field strength is determined by placing the field strength meter s on top of or directly alongside the equipment under test and monitoring the field strength meter via a remote field strength indicator outside the enclosure while adjusting the continuous wave to the applicable antennae c The test is normally performed with the antenna facing the most sensitive side of the EUT The polarization of the fiel
45. st Duration reduction period 295 Yo 250 14 2 Measurement Equipment Model No Serial No Calibration Date Valid Date TESQ NSG3060 TESQ NSG3060 1385 2012 07 03 2013 07 02 9 Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 54 of 56 CERPASS TECHNOLOGY CORP Report No TECE1211068 A C 14 3 Test Result and Data Final Test Result PASS Pass performance Criteria C for voltage interruption A for voltage dips Required performance Criteria C for voltage interruption B C for voltage dips Basic Standard IEC 61000 4 11 Product Standard EN 55024 Temperature 21 C Relative Humidity 62 Atmospheric Pressure 1011 hPa Test Date May 22 2012 Voltage UT AC 230 V 50 Hz Interval s 10s Times 3 Test level l Phase Result sakada Durations erem ICI CI Ga ap ES Note A means the EUT function is normal working during the test C means the Power of EUT is off during the test and it can be recover by manual resetting Test engineer i ef Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 55 of 56 ka e C CERPASS TECHNOLOGY CORP Report No TECE1211068 A 14 4 Test Photographs MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 5
46. urer Model No Serial No Calibration Date Valid Date MAGNETIC FIELD F 1000 4 8 G GENERATOR KeyTek HM 2012 09 26 2013 09 25 Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 51 of 56 CERPASS TECHNOLOGY CORP Report No TECE1211068 A C 13 4 Test Result and Data Final Test Result PASS Pass performance criteria ER Required performance criteria A Basic Standard IEC 61000 4 8 Product Standard EN 55024 Temperature 21 C Relative Humidity 62 Atmospheric Pressure 1011 hPa Test Date May 22 2012 Power Frequency Magnetic Field 50 Hz 1 A Coil Orientation Testing duration me tom CN Note A Mean the EUT function is normal working during the test Test engineer M4 Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 52 of 56 ka 2 Cf ue CERPASS TECHNOLOGY CORP Report No TECE1211068 A 13 5 Test Photographs MM Cerpass Technology Corp Issued Date Jun 11 2013 Tel 886 2 2655 8100 Fax 886 2 2655 8200 Page No 53 of 56 O CE 14 Voltage Dips and Voltage Interruptions Immunity Test Setup 14 1 Test Conditions 1 Source voltage and frequency 230V 50Hz Single phase 2 Test of interval 10 sec 3 Level and duration Sequence of 3 dips interrupts 4 Voltage rise and fall time 1 5 us 5 Test severity Voltage dips and Interrupt Te

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