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1. The procedure name already exists for another procedure The given procedure name does not exist Procedures cannot be defined before the compiler reaches and END TEST command otherwise the procedure could be executed at the wrong time The procedure name is too long The polarity of the pulse command has changed within the same command The string in the DISPLAY command has more than 48 characters An internal error occurred There are more pins in the pin list for the INPUTS command than the size of the IC The compiler does not recognize the syntax The specified variable does not exist The variable name is too Copyright 2007 B amp K Precision Inc names Check the spelling of the pin group name or define the pin group Pin group names must begin with a letter and can contain only letters numbers and underscores Use a name with up to 30 characters Check and correct the pin out and or the pin name syntax in your program Check the device pin out and correct the pin number Use a different name Check the spelling of the procedure name if present or enter a valid procedure Add an END TEST command before defining procedures Use a name with up to 30 characters Ensure all polarity LOW HIGH statements are the same within one PULSE command Use a shorter string Contact B amp K with details Check the IC size and correct the pin list Use correct syntax Check the spelling of the va
2. 2007 B amp K Precision Inc Page 1 CompactLink C Library Manager Preface use in conjunction with the B amp K model 570A and B amp K model 575A products for developing new IC tests 1 4 Contacting B amp K Precision Corporation B amp K Precision Corporation Website www bkprecision com 22820 Savi Ranch Parkway Telephone 714 921 9095 Yorba Linda Fax 714 921 6422 CA 92887 4604 1 5 Copyright and disclaimers This manual copyright 2007 B amp K Precision Corp All rights reserved First published October 2007 You may make electronic or paper copies of this manual solely for use in conjunction with operating the software as a bona fide customer but not for any other purpose Windows and Microsoft are registered trademarks of Microsoft Corporation B amp K Precision Corp reserves the right to make product improvements and or changes at any time without prior notice including changes to the software specifications This manual may therefore not necessarily reflect current software specifications Whilst B amp K Precision Corp makes every effort to ensure the accuracy of this manual we will not accept liability for damages incurred directly or indirectly from errors omissions in this manual or discrepancies between the manual and the CompactLink software itself Copyright 2007 B amp K Precision Inc Page 2 CompactLink C Library Manager Introduction 2 Introduction Congratulations on your decision to
3. 3 CHECK THAT 3Y IS LOW ELSE CHECK THAT 3Y IS HIGH END IF DATA DATA 1 END DO REPEAT FOR GATE 4 INPUTS 4A 4B DATA 0 DO WHILE DATA lt 3 DRIVE 4A 4B WITH DATA IF DATA 3 CHECK THAT 4Y IS LOW ELSE CHECK THAT 4Y IS HIGH END IF DATA DATA 1 END DO END TEST If you have not already keyed in this program we suggest you do it now The program is also included in the test 7400BK575 which is included as a sample user device in the database supplied with the software After entering the program click the nl Save Test button on the toolbar to save it The above is a very simple example of a test program but it does show some of the main features of the language Copyright 2007 B amp K Precision Inc Page 31 CompactLink C Library Manager Examples 7 Operational amplifier analog test program for the B amp K570A The following program is designed for an LM324 quad operational amplifier test on the B amp K 570A linear IC tester We suggest you use the sample program LM324BK570 supplied and use the debugger to establish exactly how the program works The test uses a variety of techniques to get the correct result e The test relies on a mid rail voltage for correct operation Since the test program is not aware of the actual supply voltage used for the test the mid rail voltage is measured at the start of the test using the B amp K 570A feedback network e The test uses PARAMETERS for common mode range
4. the automatic mouse hover variable display to confirm that the variables have the correct values e Break up your program into PROCEDURES with well defined input and output values which can be tested in isolation Once you have fully tested a procedure you can use ia Step Over to execute calls to it without stepping into the procedure itself which reduces the amount of stepping you need to do e Consider what happens in your test if unusual circumstances are present For example if you are reading a voltage from an IC pin remember that a faulty IC may give unusual voltages which may upset your program e Ensure that you thoroughly understand the function of the IC you are testing You will be unable to write a functional test program if you do not know how the IC will react to input signals so obtain an up to date data sheet for the device e f your program contains complex calculations split them into several lines using intermediate variables so you can follow the calculation while stepping e Ensure you are aware of the order of precedence of operators see on line syntax guide For example consider the program sequence A 1 B 5 CONDITION A lt 0 amp B gt 3 The amp operator is a higher order than the relational operators lt and gt Therefore the expression is evaluated as CONDITION A lt O amp B gt 3 which is probably not what you expect To avoid confusion rewrite as CONDITION A
5. Add at least one USER device before continuing Enter a valid name for the test Correct and errors and recompile the program Re enter the text to search for Click Cancel and save the changed program before continuing Page 42 CompactLink C Library Manager Reference Target location does not exist Do you want to create it The database file is read only and must have write permissions to be used in CompactLink There are devices that use this test You must select alternative tests for these devices before this test can be removed There was an error opening the library database This will overwrite existing test continue Unable to find the library database Unable to make database read write Unable to proceed press OK to close CompactLink Undefined discrete package type Undefined package type XXXX already exists please use a different name The chosen location for the generated library files does not exist The main IC library database cannot be opened You cannot delete a test if one or more devices are using it The main IC library database cannot be opened You are loading a text file which will overwrite the existing program The main IC library database cannot be opened The main IC library database cannot be set to read write mode The software cannot continue The specified discrete package is undefined The specified package is undefined You are trying to r
6. e f you have not already done so install the CompactLink software on the PC which is controlling your product s e Connect your B amp K 570A or 575A to a battery eliminator turn on and select CmLink mode See product manual e Connect your product to a COM port on your PC either directly or to a USB port via the USB RS232 converter supplied e Run the CompactLink software and choose Tools Configure Hardware from the main menu or from within the test development and debugging window e Click Add to add a serial hardware interface Copyright 2007 B amp K Precision Inc Page 16 CompactLink C Library Manager Writing test programs e Select a port for the interface using the Port combo box depending on the COM port used for the serial connection e Select the newly added interface by clicking and click Settings Confirm that the serial port settings are Baud rate 38400 Data bits 8 Stop bits 1 Parity None Handshaking Hardware e The Status will be automatically updated by CompactLink and will show Found if the selected interface is present on your system e Click Refresh to update the list of attached products Confirm that the list is correct for your configuration e f you wish you can click Test to run the diagnostics on the attached product The result is displayed in the list e Click OK to save the hardware configuration 4 8 Debugging your program No matter how skilful you are as a programmer inevitably your
7. Functional Test for the chosen target product e Click Select Test to open the Select Test window e Click Add New to insert a new blank test and change its name to TESTDEV Click OK to close the Select Test window e In the Edit Device window click Develop Test to open the test development and debugging window B amp K CompactLink IC Test Debugger TESTDE File Edit Debug Tools Help emg BIE 4 t No debug hardware gt A Source program for TESTDEV on B amp K 5754 target The Source Program for TESTDEV window on the left is where the test program code is entered If you wish you can click the Full Screen button at the top right of the Source Program window to expand it to simplify entry of IC test programs At the top of the window there is a ruler bar showing the tab stop positions you can use tabs in your program to make it more readable and to indent code inside procedures You can change the tab positions by Copyright 2007 B amp K Precision Inc Page 13 CompactLink C Library Manager Writing test programs choosing Tools Options Formatting from the menu or Z Options from the toolbar and entering a new Tab width value from 2 to 8 While entering the test program you can click the Save Test button on the toolbar to save the current program in the database You can also write the program to l DA PA i a text file or read in a text file using the Write Test and Load Test
8. Test op amp 3 in open loop mode DO TEST_OPEN_LOOP Test op amp 3 in buffer mode unity gain DO TEST_BUFFER Test op amp 3 in gain of 2 mode DO TEST_GAIN2 Set up pins for op amp 4 INPUT_INV INV4 INPUT_NINV NINV4 OUTPUT OUTPUT4 INPUTS NINV4 Test op amp 4 in open loop mode DO TEST_OPEN_LOOP Test op amp 4 in buffer mode unity gain DO TEST_BUFFER Test op amp 4 in gain of 2 mode DO TEST_GAIN2 END TEST PROCEDURE TEST_OPEN_LOOP Test op amp in open loop mode as follows 1 Connect ground resistor only to inverting input 2 Apply small ve voltage referred to mid rail 3 Check that the output saturates high 4 Repeat with a small negative voltage 5 Check that the output saturates low FH Set up the ground resistor on the inverting input SET FEEDBACK TO OUTPUT INPUT_INV FB_OFF GND_100R Output a small positive voltage DRIVE ABSOLUTE INPUT_NINV TO VMID 0 1 Measure the output voltage VOUT VOLTAGE OUTPUT DISPLAY Vsathigh VOUT V NEWLINE Copyright 2007 B amp K Precision Inc Page 34 CompactLink C Library Manager Examples Check if Vout is too low IF VOUT lt VSUPP VSATPOS Force a voltage too low fail on the output pin COMPARE VOLTAGE OUTPUT WITH VSUPP TOLERANCE 0 END IF Output a small negative voltage DRIVE ABSOLUTE INPUT_NINV TO VMID 0 1 Measure the output voltage VOUT VOLTAGE OUTPUT DISPLAY Vsatlow VOUT V NEWLINE Check if Vout
9. VMID 1 Repeat with increasing values of VIN in 0 5V steps DO WHILE VIN lt VMID 1 Drive the input and measure the output DRIVE ABSOLUTE INPUT_NINV TO VIN VOUT VOLTAGE OUTPUT Display the results for debugging purposes DISPLAY Vin VIN V Vout VOUT V NEWLINE Compare output with gain diff input voltage COMPARE VOUT WITH VMID 2 VIN VMID TOLERANCE 0 3 VIN VIN 0 5 END DO END PROCEDURE Copyright 2007 B amp K Precision Inc Page 36 CompactLink C Library Manager Reference 8 PLIP command and function reference 8 1 Introduction Full details of all PLIP commands and functions are included in the software so you can get help on syntax at any time while developing your program To access this on line syntax help do the following e Click in the Source Program window in the word you wish to look up e Choose Help Syntax from the menu or right click and choose Syntax Help from the popup menu or press F1 e f the selected word appears in several topics choose the most applicable topic from the list displayed The PLIP Syntax Guide will now be displayed The following words phrases are used throughout the command function descriptions expression a valid expression containing numbers variables arithmetic and or logical operators and functions condition an expression that evaluates to either 0 FALSE or 1 TRUE Usually the expression will include a relational operator e g
10. buttons on the debug toolbar These functions allow you if you wish to write programs in text format using an external text editor before reading them into the CompactLink debugger The debug window also contains menu commands and toolbar buttons for compiling and downloading the test executing and stepping programs setting breakpoints and watch values The meaning of these will become clear as you work through the example 7400 test later on 4 3 Entering and compiling a program Before starting to work on a real program we will first have a look at the operation of the editing and compilation system used for PLIP programs In the Source Program window type in the following PLIP program A 0 B A D C A E Compile the program by clicking the a Build Test button and observe the results At the bottom left in the Info window you will see that the compilation failed with 2 errors and 1 warning as follows Info m Build Status Error Variable D undefined Errors 2 Error Variable E undefined Warnings 1 Build Errors Wamings Info Copyright 2007 B amp K Precision Inc Page 14 CompactLink C Library Manager Writing test programs 4 4 Fixing the errors and warnings This is a simple program using variables and expressions The variables A B and C are defined but the variables D and E have not been defined yet are used in expressions This is an error as the compiler shows CompactL
11. device e f the device has a clear or reset function test that first as then the device will be in a known state e If there is no clear or reset function read the current state of the device outputs using the RESPONSE function and use that in your program to calculate the next state e Some device outputs may not be available externally e g a counter may only have a carry output and the actual counter outputs may not appear externally In this case you may have to clock the device many times until the carry appears so that you then know what state the device is in In accordance with the above a typical sequence for a sequential device would be e Specify the inputs of the IC under test with the INPUTS command Copyright 2007 B amp K Precision Inc Page 23 CompactLink C Library Manager Examples e Get the device into a known state using a clear or reset input or issue clock pulses until a known state is reached e Apply the desired logic levels to the inputs with the DRIVE command Apply one or more clock pulses depending on the nature of the device Check that the outputs respond correctly with the CHECK THAT command 5 1 3 Tri state devices buffers bus drivers Both combinational and sequential devices may have tri state outputs these outputs can be turned off or made high impedance by an enable input so that other devices on a board can drive the pins in a bus structured system A typical combinat
12. device Click on a device in the list e Choose Device Copy from the menu or right click and select Copy e Enter anew name for the New Device Name and click OK The new device will then be added to your USER library Locate it in the library list and double click on it to edit You can now change the various entries for the device without affecting the original device in the library Copyright 2007 B amp K Precision Inc Page 7 CompactLink C Library Manager Writing test programs On both products there is only a numeric keypad available for entering device numbers Therefore on the edit tabs there is a field Use Number provided for a numeric part number For example if the full part number for a new device is LM339N you may wish to enter the number 339 in the Use Number field The B amp K 575A and B amp K 570A products contain an internal library of IC tests which is not visible in the CompactLink software When deciding which test to execute the product software will give priority to the user library if a device with the same number exists In the above example the 339 new user test for the LM339N will be executed rather than the built in LM339 test if you wish to have both tests available use a different number e g 3390 for the user test 3 12 Specifying a functional test for the IC If you have enabled Functional testing for your newly added device you have to specify which functional test to use The actual functional t
13. help topic Missing syntax help for the selected topic There was an error saving the new test details in the database There was an error saving the copied test details in the database There was an error loading the device details from the database There was an error loading the test details from the database There was an error saving the device details in the database There was an error saving the test details in the database The selected function is not present in the software The size of the displayed memory block must between 1 byte and 12k 12 288 bytes The voltage value being entered is invalid There are no devices in your USER library You are trying to rename a test with a blank test name You cannot set breakpoints until you have successfully compiled your program The text being sought in the program was not found The program source text has been changed If you exit the debugger now you will lose your changes Copyright 2007 B amp K Precision Inc Choose another line for your breakpoint Choose another word Choose another topic Contact B amp K with details of the problem Contact B amp K with details Contact B amp K with details Contact B amp K with details Contact B amp K with details Contact B amp K with details Contact B amp K with details Contact B amp K with details Change the start and or stop addresses for the memory dump Re enter according to the limits given
14. lt etc but any expression which gives the result 0 or 1 will work pin name a text string of up to 8 characters giving the name of an IC pin as defined in the IC definition database Note that you can use the default strings PIN 1 PIN 2 etc if for some reason you do not wish to use the defined pin names If the IC pin definition contains several pins with the same name only the first one will be used by the compiler in programs The remaining pins MUST be referenced by the text PIN 1 PIN 2 etc pin name list a text string containing a list of up to 8 pin names defined as above Usually the pin name list will be contained in square brackets pin group a text string that is used as an identifier to refer to a group of pins that are logically connected with each other The pin group is identified by the use of angular brackets lt gt The text string can have a maximum of 30 alphanumeric characters and can contain underscores procedure name a text string which is used as an identifier to refer to a procedure defined in your program The text string can have a maximum of 30 alphanumeric characters and can contain underscores this symbol is used in some of the examples to indicate that other non specified program lines are present on these lines Copyright 2007 B amp K Precision Inc Page 37 CompactLink C Library Manager Reference variable name a text string that is used as an identifier to refer to a
15. lt 0 amp B gt 3 which makes it clear what you are trying to achieve e f your program uses loops e g DO WHILE ensure that the loop condition can eventually become false and your program cannot get stuck in the loop For example consider the following loop in a B amp K 570A program DO WHILE VOLTAGE OUTPUT lt 5 DRIVE INCREMENTAL INPUT WITH 0 05 END DO If the output voltage never exceeds 5V which could happen for example if the IC is faulty the program will remain in the loop and will get stuck To avoid this try the following Set an execution limit for the loop Copyright 2007 B amp K Precision Inc Page 20 CompactLink C Library Manager Writing test programs LOOP_LIMIT 1000 Adjust input voltage until output goes above 5V DO WHILE VOLTAGE OUTPUT lt 5 amp LOOP_LIMIT gt 0 DRIVE INCREMENTAL INPUT WITH 0 05 Count number of times we go round the loop LOOP_LIMIT LOOP_LIMIT 1 END DO This is far more complex but ensures your program cannot get stuck in a loop If the loop executes 1000 times the LOOP_LIMIT variable will become zero and the loop will exit Once you are sure your program is working correctly you can remove such error trapping code Note that this uses the amp logical operator to combine 2 test conditions for the loop condition ensure you use the brackets as shown to ensure the 7 expression is evaluated as you intend You can use the K Stop button to force
16. on the B amp K 575A digital IC tester 6 1 Defining the IC inputs The first step in any test program is to define the input pins of the IC under test so that the test target product can switch on the drive on these channels This is achieved using the INPUTS command Enter the command line into the editing window as follows INPUTS 1A 1B 2A 2B 3A 3B 4A 4B This command tells CompactLink that the pins listed are all inputs to the IC and any pins not listed are assumed to be outputs Note that for test programming purposes power supply pins are assumed to be outputs from the IC under test You do not need to refer to the pin numbers directly although you can do so if you wish by using the syntax PIN 1 PIN 3 etc because the compiler will substitute the correct numbers from the device information later When CompaciLink or the target product executes this command line it will perform various checks on the given pins prior to continuing with the test depending on the target product For example it will check that all the given input pins can be properly driven with valid logic levels All these checks take place on the first and only the first INPUTS command line in your program so the first INPUTS command should define all the inputs We can now go on to drive the input pins for the first gate with a suitable test pattern and check the output so the program now looks like this INPUTS 1A 1B 2A 2B 3A 3B 4A 4B I
17. program will have problems commonly called bugs in it The purpose of the debugger is to help you identify these problems and fix them before adding the test to your library As an exercise in using the debugger enter the short program as described in sections 4 3 to 4 5 above then carry out the following steps B amp K CompactLink IC Test Debugger TESTDEY Compile the program by clicking the oid Build Test button Send the compiled test program to the hardware by clicking the ue Send Test button You should then see the following display lol x Fie Edt Debug Tools Help Go eS lE s e s z aE 3 Pe R p Source program for TESTDEV on B amp K 575A target p Debug Status Frog Sample program to show variable definition and expression use r Define variables A D E and initialize ji al Symbols Break a Value Address D 1 A C090 E 2 D cog Define variables B and C and initialize with expressions E cogs B A D B cosc C A E a coag Tell PLIP this is the end of the test END TEST Result Result Line 3 Character 110 IC pin status Display output Info i E Build Status Build Ewors Warnings Info Enos iy Info No ist fle specified i Info No object fle specified Wamings None Info Compiler started at 13 10 46 on 29 October 2007 Info PLIP source file detect Info Define B amp K 575A test header information Info Define variable A 4 byt nfo De
18. sequence of signals repeating many times during a test for example internal registers that need to be read or written to configure the device operating mode Use the PROCEDURE END PROCEDURE construction to write data to registers so that it can be called from several places in your program Copyright 2007 B amp K Precision Inc Page 24 CompactLink C Library Manager Examples e f you cannot determine the exact response of the device outputs from the data sheet use the following technique e Use DRIVE and or PULSE commands to apply logic levels and clock pulses to the inputs e Use the DISPLAY command with the RESPONSE function to read the output response and display in the text output window in the debugger e Once you have determined how the IC responds include CHECK THAT commands to test for the expected response e If the device will not operate at slow speeds use the debugger breakpoint system in conjunction with the DISPLAY command to get debugging information about the test 5 2 Analog test programming Analog ICs by their very nature are more difficult to test than digital ICs Consequently analog IC tests are often quite complex even for very simple components such as transistors and diodes The following commands are provided for analog test programming Stimulus Commands Use DRIVE ABSOLUTE Drive a defined voltage onto the input pin of the IC under test DRIVE INCREMENTAL Cha
19. the database Copyright 2007 B amp K Precision Inc Page 10 CompactLink C Library Manager Writing test programs file B amp KCompactLinkICLibrary dat to ensure you do not lose wanted data You can open the folder containing the complete IC library database by clicking Start Program B amp K CompactLink Database 3 15 Printing or exporting a device If you wish to have a hard copy record of a device you can create a report and then either print the report or save it to a text file To do this select the device in the Library Review screen and select Device Print Export from the menu or alternatively right click on the device and choose Print Export In the report window which appears you then have the choice between Export which saves the device details as a text file and Print which sends the details to your printer 3 16 Generating library files Once you have completed adding devices and or tests you will probably want to generate a set of library files to include the new device in the library of your product There are 2 options which can be selected from the Library menu e Update B amp K 575A User Library This produces a B amp K 575A user library file BK575ALIB CML file which can be downloaded and programmed into your B amp K 575A over the serial cable e Update B amp K 570A User Library This produces a B amp K 570A user library file BK570ALIB LML file which can be downloaded and programmed into your B amp K 5
20. working quickly followed by more detailed instructions on the various functions We recommend you read at least sections 1 to 3 before using CompactLink for the first time This manual is written on the assumption that you are already familiar with the B amp K model 570A and or B amp K model 575A products Please refer to the manuals for those products if you require further information This symbol is used where the information given is important to prevent damage to your system or board under test 1 2 Precautions 1 2 1 Host PC The CompactLink software is designed for use on a PC running Microsoft Windows XP software Operation on any other type of PC or with any other operating system is not supported and may cause problems in use 1 2 2 Data storage The CompactLink software uses a local database for storing IC details and test programs Any new ICs you add to the system are stored in the file B amp KCompactLinklCLibrary dat in a fixed location you can open the folder containing the complete IC library database by clicking Start Program B amp K CompactLink Database It is important that this file is backed up regularly to ensure that user devices and test programs are not lost in the event of a hard drive failure 1 3 Maintenance 1 3 1 Software The CompactLink software is not warranted as being fit for any particular purpose although B amp K will make every effort to ensure that it is suitable for Copyright
21. 0 or positive The program has run out of internal stack memory This usually happens when a procedure is called repeatedly without returning The seed for the RANDOM function must be a non zero positive number The pin number expression evaluates to a number which is Copyright 2007 B amp K Precision Inc statement in your program in the correct position Action Modify the program so that the divisor cannot become zero during execution or test for this condition to avoid the division operation Modify your program to ensure that this cannot occur Ensure that all procedures complete before they can be called again Modify your program so that the argument expression for the RANDOM function is always positive Modify your programs to ensure that the pin number Page 49 CompactLink C Library Manager Reference Bad tolerance Bad 10 bit DAC value Bad 8 bit value DAC Bad array index either zero negative or greater than the IC pin count The TOLERANCE argument for the B amp K 570A COMPARE command must be zero or positive The voltage is too high for the 10 bit DAC operation The voltage is too high for the 8 bit DAC operation The index of the ARRAY must be in the range 0 to 127 Copyright 2007 B amp K Precision Inc expression gives the correct result Modify your programs so that the TOLERANCE expression evaluates to a positive number Modify your program so that the volta
22. 400BK575 14 B amp K 5754 USER Gate QUAD 2 INPUT NAND GATE PLIP TEST FOR B amp K 5754 Copyright 2007 B amp K Precision Inc Page 5 CompactLink C Library Manager Writing test programs 3 6 IC library data structure The data for each IC in the library is organized into Device Information and Target Information Each device can have one or two targets each containing target specific information for both products supported by CompactLink B amp K model 570A and B amp K model 575A The devices in the internal library provided with the product are not included in the CompactLink database but can still be accessed by entering their numbers in the usual way on the unit keypad See the product manual s for a full device listing A full list of all device information entries with their meanings is given in appendix 10 1 3 7 Theory of CompactLink operation The following steps are required to add an IC to the library for use on the B amp K model 570A or B amp K model 575A products This is a summary full details are given later in the manual Add a new device to your USER library using CompactLink Fill in the device information from the device data sheet Enable the target product with which you wish to test the device Fill in the target information for the device target combination Enable the functional test for the chosen target product Choose a test for the device or develop a new test if no suitable test is available Gen
23. 70A over the serial cable As an example assume we are going to generate a user library file for the B amp K 570A Choose Library Update B amp K 570A User Library from the menu and the Update Library window appears as follows assuming the B amp K 570A is actually connected to the COM1 port as shown i i Update Library x Updating library for B amp K 570A Connected Hardware B amp K 5704 on COM1 x Setup User Library Build new library file le IV Recompile tests IV Build library file V Backup existing files IV Download library file on success Update from existing file Filename l Copyright 2007 B amp K Precision Inc Page 11 CompactLink C Library Manager Writing test programs The process has 4 stages enabled by the 4 check boxes as follows e Firstly you must compile all your user tests The integrated debugger uses a different format for compiled tests to allow easy debugging so all tests need to be recompiled at this stage Select the Recompile Tests check box to enable the compiler to compile all B amp K 570A tests e Enable the Build library file check box to generate the library file for the selected product In this case the file BK570ALIB LML will be generated in the folder specified by the Tools Options menu function e Ifyou want to create a backup of any existing user library files enable the Backup existing files check box A backup folder will be created and the existing libr
24. BK aa a VE wir Y ELECTRONIC TEST INSTRUMENTS CompactLink IC Library Manager OPERATOR S MANUAL CompactLink C Library Manager Contents CONTENTS Teeny IPROTACS ve aicsetichecedstet ccsestedecssie0t hsawtedesescenedacdaeds N 1 1 1 How to use this manual eee eeeeeeeeseeeeeeeeeeeeeeeeaeeeeeeneeeeeenaeeeeeeaa 1 1 2 Precauti ns ss iere act ete ait eae oie atin hates 1 1 2 1 OSE PG 58 A E cota ectsdiueds E cavecen 1 1 2 2 Data Storage ieii aies nanana eaae ee aasar 1 1 3 Maintenance 1 3 1 Software 1 4 Contacting B amp K Precision Corporation ccsceesceeeseeeeeeeeteeeeaes 2 1 5 Copyright and disclaimers ceceeeeeeeeeeeeeeneeeeeeeeeeteaeeteeeteaeeseaes 2 2e ModCenter ee e 3 2 1 What is CompactLink 0 cceeecceeceeeeeeeeeeeeeneeeeeeeeeneeseeeeeeeseaeeeeaes 3 3 Getting Started aret pe aana a neo ain toe mee eee 4 3 1 Checklists naeris teed aitenei ta a ai aE aaa E eaea 4 3 2 System reQuireMentS m dir seisseto areis iiaia rearen nar taida ciaee Tinia 4 3 3 Installing the security dongle ssseeseeesesessreeesrrerrrrrerrrrerrrresrrreee 4 3 4 Installing CompactLink 0 0 0 ceceeeeeeeeeeeeeeeeeeeeeeneeeseeeeeeesieeeeeees 5 3 5 Runninig Compactlink rss acts tccescssces ccsetecpeecchdsaneasiecphactnadieaaideasenceas 5 3 6 IC library data StrUCtUIe sssini eini iiie 6 3 7 Theory of CompactLink OperatiOn cccceeeeeeeeeeeeeeeteeeeteeeteeeeee 6 3 8 Reviewing the I
25. C library eccceeceeseeeeeeeeeeeeeeeeeeeneeeeeeeeeeeeteeeeeees 6 3 9 Adding an IC to the USER library 0 00 eeceeeeeeeeeeeeeeeeneeeeneeeeeereaes 7 3 10 Viewing an lGiis cit tite ies ein en ete es 7 3 11 Copying editing an IC oo ceeeeeneeeeeeeeeneeeeaeeseaeeeeeeseaeeseeeeaes 7 3 12 Specifying a functional test for the IC ooo eee eeeeeeeeeeeeeeeeneeeeneeeeaes 8 3 13 Developing a functional teSt e eee eeeneeeeeneeeeeeneeeesenneeeeenaees 10 3 14 Deleting an IC from the USER library ec eeeeeeeeeeeeeeeeeeeeeeeeeee 10 3 15 Printing or exporting a device 0 eee ee eeseeeeeeeneeeeeneeeetenneeeeenees 11 3 16 Generating library fiIlCS ee eee eee eeeeeeteeeeeeeeeseaeeteaeeteaeeseeeeeea 11 4 Writing your own test PrograMs ee eeceeeseeeeeeeneeeeeeneeeeeeneeeeeeneeeeeeae 12 4 1 Introduction AO PIP eisato r bres iiair ahleenees 12 4 2 Opening the test development and debugging window 13 4 3 Entering and Compiling a PrOQraM eeeeeeeeeseeeeeesteeeeeeneeeeeeneeeees 14 4 4 Fixing the errors ANd Warnings cceeeeeeeeeeeneeeeeeneeereeneeeeeeneeeees 15 4 5 Getting hel mieren Aire ene iis Geen ies 15 4 6 DOCUMENTING your program eeeseeeeeeeteeeeeeneeeeeenaeeeseeeeeeeeneeeees 15 4 7 Connecting to NardWware ecceeeeeseeeeseeeeeeeeeeeeeeeeeeeeeeeseaeeteeeene 16 4 7 1 Connecting to B amp K 570A 575A products cccceecceeeeeereeees 16 4 8 Debugging you
26. END PROCEDURE without corresponding PROCEDURE Expecting Y after expression or function Expecting after function Expecting after round digits expression Expecting after 2nd pin in SET FEEDBACK TO command Expecting after Meaning Parameters are read only and cannot be changed in a program Procedures cannot be defined inside a program loop Procedures cannot be defined inside a program IF ELSE END IF construction The END TEST command cannot be inside a procedure The ELSE command did not match up with a corresponding IF The END DO command did not match up with a corresponding DO WHILE The END IF command did not match up with a corresponding IF The END PROCEDURE command did not match up with a corresponding PROCEDURE There was a missing closing bracket in the built in function call or expression There was a missing closing bracket in the built in function call There was a missing closing bracket after the round digits expression in the ROUND built in function There is a missing comma in the argument list for the SET FEEDBACK TO command There was a missing Copyright 2007 B amp K Precision Inc Action Remove the code which is attempting to change the parameter or use a variable instead of a parameter Move the procedure elsewhere in your program Move the procedure elsewhere in your program Specify the END TEST command before the proc
27. ND gate if the value of DATA is 3 i e both inputs high the output is expected to be low otherwise it should be high Finally after one run through the test program the value of DATA is incremented by 1 and the END DO command causes execution to return to the DO WHILE command line and repeat the entire program section This will continue until the value of DATA is 4 when execution will continue after the END DO command line Notice in both the above two program segments that we have indented by 4 spaces or a tab the code following an IF ora DO WHILE statement but the relevant ELSE END IF and END DO commands revert to the original column on the display This is not necessary for your program to work but it improves the readability of your program particularly when DO WHILE END DOor IF ELSE END IF blocks are nested inside each other We suggest you get into the habit of doing this when you write your programs 6 4 Complete program for logic NAND gate The program to test the first gate in the package now looks like this INPUTS 1A 1B 2A 2B 3A 3B 4A 4B INPUTS 1A 1B DATA 0 DO WHILE DATA lt 3 DRIVE 1A 1B WITH DATA IF DATA 3 CHECK THAT 1Y IS LOW ELSE CHECK THAT 1Y IS HIGH END IF DATA DATA 1 END DO It would be a good idea at this stage to test the program with the debugger to ensure that it functions as expected before going on to test the other three gates in the package In this way if any
28. NPUTS 1A 1B 6 2 Simple test for a logic NAND gate Now we are ready to test the first logic gate in the IC and to do this we need to drive both inputs with all four possible states according to the truth table for a NAND gate and check that the output responds accordingly We could do this with the following program segment DRIVE 1A LOW 1B LOW CHECK THAT 1Y IS HIGH Copyright 2007 B amp K Precision Inc Page 27 CompactLink C Library Manager Examples DRIVE 1A HIGH 1B LOW CHECK THAT 1Y IS HIGH DRIVE 1A LOW 1B HIGH CHECK THAT 1Y IS HIGH DRIVE 1A HIGH 1B HIGH CHECK THAT 1Y IS LOW 6 3 Improved logic NAND gate test with looping Whilst the above program will work there is a more compact way of achieving the same result using another programming construction the DO WHILE END DO construction This is a commonly found construction allowing blocks of program code to be repeated until a condition is true Consider the following program segment DATA 0 DO WHILE DATA lt 3 DRIVE 1A 1B WITH DATA IF DATA 3 CHECK THAT 1Y IS LOW ELSE CHECK THAT 1Y IS HIGH END IF DATA DATA 1 END DO The above loop actually contains slightly more code than the original simple program but can easily be modified for gates with 3 or more inputs to produce far more compact code It is of course more complex and introduces several other programming concepts Firstly we have now defined a variable called DATA which is initialize
29. a breakpoint in a loop which is executing indefinitely e Use the DISPLAY command to show debugging information in the Display Output window at the bottom right For example in the above program DISPLAY VOLTAGE OUTPUT VOLTAGE INPUT will show the voltages at the input and output pins so you can see if they are as expected before using them in subsequent calculations and DISPLAY 1000 LOOP_LIMIT will show how many times your loop executed before exiting e When you have tested parts of your program to your satisfaction use breakpoints to stop your program execution after the tested parts so you can then use stepping to test the remainder of the program Further examples of common program errors are given in the online syntax help Copyright 2007 B amp K Precision Inc Page 21 CompactLink C Library Manager Examples 5 Some common programming concepts Although PLIP is a reasonably simple language to use some of the concepts involved in IC test programming can be quite complex The basic principle behind any IC test program is quite simple e Stimulate the inputs of the device under test with the correct logic levels or analog voltages e Check that the outputs of the device under test respond as expected to the input signals e Ensure that the chosen sequence of input signals covers all aspects of device operation However this is not always as simple as it may seem To make your program as successful as possible a
30. a logic NAND gate eccececceeeeeeseeeeereeeeeeteeeeeee 27 6 3 Improved logic NAND gate test with lOOping eeeeeeeeeeees 28 6 4 Complete program for logic NAND gate ceeceeeeeeeeeeereeee 29 7 Operational amplifier analog test program for the B amp K570A 05 32 8 PLIP command and function reference eeseeeeeeseeeeeeneeeeeeneeeteenees 37 8 1 Introduction ia eaa a a ea arrana Ea aac ad 37 9 Troubleshooting and SUppoOrt ssssssessseseiieerirreriirssrirnsrrirnerirnnrrnnnerennne 39 10 Appendices irisan nanen a RS ee SI a 40 10 1 Library parameter reference 0 ee eeeeeeesteeeeeeneeeeeeneeeenenaeeeeennees 40 10 2 CompactLink error warning Messages cceeeceeeeeeeeeeeeeteeeeneees 41 10 3 PLIP error messages s nessecsssriserernrcsrurernneernnnrenennrnniaecnnnnennnane 44 10 4 PLIP warning message e isiin eendit 49 10 5 PLIP run time error MESSAGES eeeeceeeeeseeeeeeneeeeeeneeeeeenneeeeenaees 49 We Tae E E E AT S ES 51 Copyright 2007 B amp K Precision Inc ii CompactLink C Library Manager Preface 1 Preface Thank you for purchasing the B amp K CompactLink IC Library Development Manager software Please refer to this manual before attempting to install or use the software 1 1 Howto use this manual This manual is divided into sections describing all aspects of CompactLink operation There is a getting started guide designed to get you up and
31. ary file s will be copied to it before being overwritten with the new file s e f you have a product connected enable the Download library file on Success check box This will cause the generated file s to be automatically downloaded to the product provided the compilation and file generation processes executed correctly e f you have previously generated a library file using the above procedure you can enable the Update from existing file check box to skip the compilation and building stages and just download the previously generated file Once you have done this you can disconnect the product from CompactLink and the ICs will then be available in the user library 4 Writing your own test programs 4 1 Introduction to PLIP Once you have added a device to the library you can also add a functional test to the device to perform a truth table or analog depending on the target product and the device type test on the device Functional tests for both target products are written in a high level programming language called PLIP The PLIP test programming language is a high level language designed specifically for test programming The syntax is highly descriptive so that programs are to a large extent self commenting but of course comments can be inserted if required IC pins are referred to by their names as defined by the IC device information to avoid continual reference to the pin out during programming and to make the programs mo
32. cklist The following items are included in the CompactLink package CompactLink CD CompactLink USB security dongle USB to RS 232 converter Serial connection cable Operator s manual The package may also include FLASH IC s for updating of older B amp K model 570A or B amp K model 575A products 3 2 System requirements The CompactLink software should be installed on a PC with the following minimum specification Intel CPU 1GHz or equivalent 128M RAM 500MB hard drive space CD DVD drive Free USB port Microsoft Windows XP operating system service pack 2 recommended For debugging and library updating your PC requires a connection to the model 570A or 575A IC tester to allow test programs to be developed and added to the library This uses a serial COM port or USB to serial converter 3 3 Installing the security dongle Before the CompactLink software can be used the USB security dongle must be installed The drivers are included on the CompactLink installation CD and must be installed as follows e Ensure you are running Windows XP on an account with Administrator privileges Copyright 2007 B amp K Precision Inc Page 4 CompactLink C Library Manager Writing test programs Insert the CompactLink CD in the CD or DVD drive e Click Start Run Browse on your PC and navigate to your CD ROM drive usually drive D with the CompactLink CD inserted e Select the file CBUSetup exe and
33. click Open then click OK to start the installation e Follow the instructions on the screen Once the installation has completed the USB security token can be inserted into any available USB socket on your computer 3 4 Installing CompactLink To install the CompactLink software follow this step by step procedure e Insert the CompactLink CD in your CD or DVD drive e Click Start Run Browse on your PC and navigate to your CD ROM drive usually drive D with the CompactLink CD inserted e Select the file setup exe and click Open then click OK to start the installation e Follow the installation instructions on the screen We recommend that all options are left at their default values 3 5 Running CompactLink To launch the software click Start Programs CompactLink CompactLink on your PC You can also create a desktop shortcut if you wish to make starting easier The opening screen example below shows the Review Library screen displaying a list of devices in your USER library and provides a menu to access all software functions oix File Library Device Tools Help r Review Library Target All v Find Device Function Device Size Target Family Class Function BKS7OSAMPLE 14 B K 5704 USER Op Amp SAMPLE PLIP TEST FOR B amp K 5704 BKS75SAMPLE 14 B amp K 5754 USER Gate SAMPLE PLIP TEST FOR B amp K 5754 LM324BK570 14 B K 5704 USER Op Amp QUAD OP AMP FLIP TEST FOR B amp K 5704 7
34. contains the parameter initializing code in PLIP format List of pin names for device Power supply voltage for the device Voltages below this value and above low threshold are MID LOW invalid Above this value and below high threshold are MID HIGH invalid When sorting the list of devices in the library the default order is alphanumeric However if Intelligent sort is enabled Tools Options Review this text field can be used to separate devices in your user library from different device technology groups e g LS HC ACT etc It can be left blank if not required Version identification string for the device Not used by system Ticked if one of more device outputs is tri state Ignored for B amp K570A The device number must be numeric This number will be used to recognize the user test when entered on the product keypad Version identification string for the device Not used by system 8 characters per pin max B amp K575A 3V to 5V B amp K570A 2 5V to 10V 10V to 10V 20 characters max 10 characters max 8 characters max 10 characters max 10 2 CompactLink error warning messages Message A folder name cannot contain any of the following characters lt gt A maximum of three breakpoints can be set Are you sure you want to delete XXXX Are you sure you want to delete the test XXXX Build cancelled by user Build failed Meaning You are specifying an invalid characte
35. d to the value O by the first line in the segment Variables in PLIP are stored in floating point format and can have values ranging from 32767e 99 to 32767e 99 The variable name itself can have up to 30 alphanumeric characters including underscores but must begin with a letter The second line contains a DO WHILE condition All the program lines in between the DO WHILE and END DO commands will be executed repeatedly until the condition is false It follows therefore that the program must contain code to change the condition otherwise the program will stick in an endless loop In this case the condition is that the value of DATA must be less than or equal to 3 for the following program lines to be executed Also here on line 3 we have introduced a modified form of the DRIVE command using square brackets to group together the two input pins This form of the DRIVE command allows a numeric value to be driven in binary form i e Copyright 2007 B amp K Precision Inc Page 28 CompactLink C Library Manager Examples 1 bit at a time onto the pins contained in the command In this case this means that bit 0 of the variable DATA is driven onto pin 1A and bit 1 is driven onto pin 1B On line 4 we are using anIF ELSE END IF construction to decide on the expected value of the output logic level depending on the input state You will see that the above program correctly tests the output pin according to the truth table for a NA
36. ecautions 1 Printing a device 11 Programming concepts 22 R Reviewing the IC library 6 Run time errors 19 Running CompactLink 5 S Specifying a functional test 8 Copyright 2007 B amp K Precision Inc System requirements 4 T Test development window 13 Troubleshooting and support 39 V Viewing an IC 7 W Writing test programmes 12 Page 52
37. edure definition s in your program Add an IF statement at the correct location or remove the ELSE statement Add a DO WHILE statement at the correct location or remove the END DO statement Add an IF statement at the correct location or remove the END IF statement Add a PROCEDURE statement at the correct location or remove the END PROCEDURE statement Use correct syntax Use correct syntax Use correct syntax Use correct syntax Use correct syntax Page 44 CompactLink C Library Manager Reference expression Expecting list in group pin Expecting in input pin list Expecting in pin list Expecting to separate items for display Expecting J after index expression array e Expecting to terminate string Expecting X after expression or function Expecting X in expression Expecting after array definition Expecting after pin group name Expecting after pin list or group Expecting after variable name Expecting gt to terminate pin group Expecting BY name or number Expecting expression after pin Expecting LOW or HIGH after pin name or number Expecting pin name or pin number Expecting pin name or pin comma after expression There is a missing comma in the list of pins given for the pin group There is a missing comma in the list of pins given in the INPUTS command There is a missing comma in the list of pin
38. ename a test using a name that already exists Copyright 2007 B amp K Precision Inc Click Yes to create a new folder with the given name Check that the file Database _Name is present in the Title folder and check that it is not read only Check that it is not open within another running version of Title Click Yes to attempt to fix the problem Specify alternative tests for the devices before deleting Check that the file B amp KCompactLinkICLibrary dat is present and not read only Check that it is not open within another running version of CompactLink Click Yes if you want to overwrite the program otherwise click No and save the existing program Check that the file B amp KCompactLinkICLibrary dat is present Check that the file B amp KCompactLinkICLibrary dat is present and not read only Check that it is not open within another running version of CompactLink Click OK and restart the software Contact B amp K with details Contact B amp K with details Choose a different name Page 43 CompactLink C Library Manager Reference 10 3 PLIP error messages Message Cannot change parameters Cannot define procedure inside a DO WHILE loop Cannot define procedure inside an IF ELSE END IF construction Cannot end test inside procedure ELSE found without corresponding IF END DO without corresponding DO WHILE END IF without corresponding IF
39. erate the USER library files and download them to the product e The added device is now available in your product device list 3 8 Reviewing the IC library After installation the library will be empty but as you add ICs they will be displayed in the Library Review table By default the entire list is shown but you can restrict the display to a particular Target by using the combo box If you want to find a particular device enter its number in the Find Device box You can also filter the list by entering text in the Function box the list will be filtered to show only those entries containing the entered text You can also sort the list of devices by clicking on any of the column headings in the Library Review display If you sort on the Device column by default the full device name is used to sort the entries However if you click Tools Options you can turn on Intelligent Sort which uses the numeric part of the device name only to produce a more logical list of devices Copyright 2007 B amp K Precision Inc Page 6 CompactLink C Library Manager Writing test programs 3 9 Adding an IC to the USER library To add a new IC to the library choose Device Add from the menu You will see the usual Edit Device Definition screen but this time with blank or default entries On the Device Information tab fill in the Name and Function boxes and enter suitable values for the other options The new device defaults to 14 pins so you may wi
40. ests are stored separately from the devices since several devices with comparable functions and pin outs will usually share one test When you enable Functional testing you will see in the Functional Test Configuration area that the Current Test entry is blank showing that as yet no test has been selected for the device To select a test click the Select Test button to show the Select Test window as shown below Copyright 2007 B amp K Precision Inc Page 8 CompactLink C Library Manager Writing test programs x Device BK575SAMPLE Selected Test BK575SAMPLE Clear All BK 5754 tests Find Test Name Type Version Date Used b 74008K575 PLIP USER 1 00 26 10 2007 11 51 1 device 7400BK575 BKS75SAMPLE PLIP USER 1 00 25 10 2007 14 48 1 device BK5755AMPLE gt i Copy Test Add New Rename Delete Select Test preview B amp K 5754 test Sample digital test for B amp K 5754 digital IC tester Define inputs to the device under test This will also turn on the power supply to the device INPUTS 41 B1 Drive both input pins low The Select Test window displays a list of all PLIP tests present in the system PLIP is the CompactLink built in test programming language and allows you to develop and debug a test using the integrated debugger which will be described in detail later in the manual If your new device is pin and functional compatible with an existing device it can probably make u
41. fine variable D 4 byte Info Define variable E 4 bytes Info Define variable 8 4 bytes z Info Define variable C 4 bytes xz R Copyright 2007 B amp K Precision Inc Page 17 CompactLink C Library Manager Writing test programs e The 4 execution buttons Oe BA E Execute Step In Step Over and Reset are now enabled and the current execution line A 0 is highlighted 7 e A further button K Stop is displayed but not yet enabled This enables a running program to be stopped and is only enabled during program execution e Note that the 5 variables A to E are listed in the Variables debug tab on the right but the values are shown as since we have not yet executed the program e Click the aJ Step In button to step the program Notice that the variable values are now updated and the execution line moves on to the next line D 1 If you hover your mouse pointer over any of the variables in the Source Program window the value will be shown e Continue stepping the program and observe the variables updating as the program executes 4 9 Setting breakpoints Stepping through the simple program above is easy enough but for more complex programs it can take a long time to step through the entire program Breakpoints are up to 3 defined locations in your program where execution can be suspended to allow you to examine variables check voltages etc You can then execute the prog
42. g to 5 levels or less Reduce the number of pins to 8 or less or split the command over two or more lines Use a different name Numbers can range from 32767e99 to 32767e99 Check the syntax and use a number within this range Use a different name Check the spelling of the parameter name or define the parameter Use correct syntax Include each pin only once Check and correct the pin out and or the pin name in your program Include each pin only once Use a different name Change to 8 pins or less or use 2 different pin group Page 47 CompactLink C Library Manager Reference Pin group XXXX undefined Pin group name XXXX contains spaces Pin group name XXXX has more than 30 characters Pin is undefined Pin number than IC size Y X greater Procedure XXX already defined Procedure XXXX undefined Procedure must be defined after main body of program Procedure name XXXX has more than 30 characters Pulse polarity changed String has more than 48 characters Symbol table internal error Too many pins in input list for a XX pin IC Unrecognised syntax Variable XXXX undefined Variable name XXXX has The specified pin group does not exist Spaces are not allowed in pin group names The pin group name is too long A pin does not exist in the device pin out The specified pin number if greater than the number of pins for the device
43. ge expression evaluates to the correct voltage Modify your program so that the voltage expression evaluates to the correct voltage Modify your program so that the array index expression evaluates to a number in the range 0 to 127 Page 50 CompactLink C Library Manager Index 11 Index A Adding an IC 7 Analog test programming 25 Appendices 40 B Breakpoints 18 C Checklist 4 CompactLink error warning messages 41 CompactLink operation 6 Compiler errors 19 Compiling a programme 14 Copying an IC 7 Copyright 2 D Debugging 17 Debugging window 13 Deleting an IC 10 Developing a functional test 10 Digital test programming 22 Disclaimers 2 Documenting programmes 15 E Editing an IC 7 Copyright 2007 B amp K Precision Inc Entering a programme 14 Example of a 7400 digital IC test 27 Exporting a device 11 F Fixing programme errors 15 Fixing programme warnings 15 G Generating library files 11 Getting started 4 H Hardware connection 16 Help 15 I IC library data structure 6 Installing CompactLink 5 Introduction 3 Introduction to PLIP 12 L Library parameter reference 40 Logical errors 19 M Maintenance 1 Page 51 CompactLink C Library Manager Index P PLIP command and function reference 37 PLIP error messages 44 PLIP run time error messages 49 PLIP warning messages 49 Pr
44. ink allows you to quickly find the errors in your program click on the error message in the Errors tab in the Info window and observe that the line in the Source Program window containing the error is highlighted You can also use the t Next Problem Previous Problem buttons to locate the errors in your program The program also has a warning that you have not included an END TEST command this is required for every PLIP program because the end of the program may not necessarily be at the end of the text if procedures are defined later in your program To fix the errors and warnings amend the program as follows and recompile 0 1 2 A D A t E END TEST awm 1 You should now have a result with no errors and no warnings 4 5 Getting help CompactLink contains extensive on line syntax help for PLIP programs To access this right click on the program text in the Source Program window and select Syntax Help from the popup menu CompactLink will attempt to find help for the word you have clicked on and will display the correct syntax with examples When the PLIP Syntax Guide is open you can choose other commands from the combo boxes at the top to learn about all the PLIP statements Note that if the chosen word in the program has more than one context you will be given a list of alternatives to choose from Help is not available for comment lines or unrecognized words You can also press F1 or choose Help Syntax from the
45. ional tri state device test sequence would be as follows e Specify the inputs of the IC under test with the INPUTS command e Drive the enable or chip select input to turn off the tri state outputs Check using the SET PULL STATE command that the outputs are properly turned off e Enable the outputs and apply the desired logic levels to the inputs with the DRIVE command e Check that the outputs respond correctly with the CHECK THAT command For sequential devices with tri state outputs similar principles apply 5 1 4 LSI and complex devices Testing complex high pin count devices such as CPUs and CPU peripherals is difficult In many cases the device data sheet does not specify exactly how the device responds to the inputs and there may be minor differences in operation between the same devices from different manufacturers Some devices may require minimum clock speeds to operate which means single stepping is impossible In addition to all this many devices are so complex that testing every conceivable aspect of device operation may not be feasible because the test would take too long Despite this it is still possible to write tests for complex devices if a few general principles are observed e ICs usually fail because of voltage spikes static pulses etc on the device pins so your test should try to ensure every pin is tested in both logic states even if the entire device function cannot be tested e Many devices need the same
46. is too high IF VOUT gt VSATNEG Force a voltage too high fail on the output pin COMPARE VOLTAGE OUTPUT WITH 0 TOLERANCE 0 END IF END PROCEDURE PROCEDURE TEST_BUFFER Test op amp in unity gain mode as follows 1 Connect 1k from output to inverting input 2 Apply minimum voltage 3 Check that the output follows 4 Repeat with stepping voltage up to maximum FF Set up the feedback resistor on the inverting input SET FEEDBACK TO OUTPUT INPUT_INV FB_1K GND_OFF Start testing with Vin at bottom of CM range VIN VCMRNEG Repeat with increasing values of VIN in 1V steps DO WHILE VIN lt VSUPP VCMRPOS Drive the input and measure the output DRIVE ABSOLUTE INPUT_NINV TO VIN VOUT VOLTAGE OUTPUT Display the results for debugging purposes DISPLAY Vin VIN V Vout VOUT V NEWLINE Compare output with input voltage COMPARE VOUT WITH VIN TOLERANCE 0 3 VIN VIN 1 END DO END PROCEDURE PROCEDURE TEST_GAIN2 Test op amp in gain of 2 mode as follows 1 Connect 1k from output to inverting input 2 Connect 1k from inverting input to ground 3 Apply minimum voltage Copyright 2007 B amp K Precision Inc Page 35 CompactLink C Library Manager Examples 3 Check that the output follows 4 Repeat with stepping voltage up to maximum Set up feedback ground resistors on inverting input SET FEEDBACK TO OUTPUT INPUT_INV FB_1K GND_1K Start testing at 1V referred to mid rail VIN
47. lways try to meet these two objectives before you start e Obtain a sample device of the type you wish to test e Obtain an up to date data sheet for the device We will discuss some of these issues in this section 5 1 Digital test programming Digital test programming is easier than analog test programming The operation of the devices is better defined and there is less mathematics involved in testing Remember the basic operations in a digital IC test program stimulate the inputs and check the outputs The following commands are provided in PLIP for digital test programming For full syntax and examples see the on line help Stimulus Commands Use DRIVE Drive a logic level onto the input of the IC under test PULSE Pulse the input L gt H gt L or H gt L gt H of the IC under test Response Commands Functions CHECK THAT Check that the output of the IC under test is in a specified logic state COMPARE Compare a group of IC outputs with a specified value RESPONSE Return a value by reading the logic states on a group of IC outputs Other Commands SET PULL STATE Set the 10k pull up down voltage high Copyright 2007 B amp K Precision Inc Page 22 CompactLink C Library Manager Examples or low INPUTS Define the inputs of the IC under test 5 1 1 Combinational devices gates buffers multiplexers Combinational logic devices are the simplest ty
48. menu 4 6 Documenting your program Although PLIP is a very readable language it is not always clear what the intention of the program is This is especially true for someone who has not Copyright 2007 B amp K Precision Inc Page 15 CompactLink C Library Manager Writing test programs written the program but has to update or modify it To help with this you can add comments to your program to explain in your own language what the program is designed to do To add a comment type a character followed by a description of the program function The above simple program could be commented as follows Sample program to show variable definition and expression use Define variables A D E and initialize A 0 D 1 E 2 Define variables B and C and initialize with expressions B aA D C A E Tell PLIP this is the end of the test END TEST You can also include blank lines to separate out blocks of code to further improve readability 4 7 Connecting to hardware Up to now we have used the CompactLink software alone with no connection to any form of test hardware However to debug programs you need a hardware connection to the test product of your choice using a serial cable to connect to a COM port on your PC A USB port can be used with the USB to serial converter supplied 4 7 1 Connecting to B amp K 570A 575A products Follow these steps to configure your CompactLink software to connect to your product
49. mistakes are found they can be corrected before continuing with the program entry However for completeness we will now give the complete program for all 4 gates in the Copyright 2007 B amp K Precision Inc Page 29 CompactLink C Library Manager Examples package You can use the text editor copy and paste to quickly copy the above block 3 times then all you need to do is change the pin names for the remaining three gates The complete program is as follows Note that we have added comment lines beginning with to make the program more readable and we have also introduced the END TEST command to mark the end of the program TEST PROGRAM FOR 7400 QUAD NAND GATE IC DEFINE ALL INPUT PINS INPUTS 1A 1B 2A 2B 3A 3B 4A 4B DEFINE INPUTS FOR GATE 1 INPUTS 1A 1B TEST ALL 4 COMBINATIONS OF INPUTS DATA 0 DO WHILE DATA lt 3 DRIVE 1A 1B WITH DATA GET EXPECTED OUTPUT ACCORDING TO INPUT IF DATA 3 CHECK THAT 1Y IS LOW ELSE CHECK THAT 1Y IS HIGH END IF NEXT VALUE OF DATA INPUTS DATA DATA 1 END DO DEFINE INPUTS FOR GATE 2 AND REPEAT ABOVE INPUTS 2A 2B DATA 0 DO WHILE DATA lt 3 DRIVE 2A 2B WITH DATA IF DATA 3 CHECK THAT 2Y IS LOW ELSE CHECK THAT 2Y IS HIGH END IF DATA DATA 1 END DO REPEAT FOR GATE 3 INPUTS 3A 3B Copyright 2007 B amp K Precision Inc Page 30 CompactLink C Library Manager Examples DATA 0 DO WHILE DATA lt 3 DRIVE 3A 3B WITH DATA IF DATA
50. ne parameters Copyright 2007 B amp K Precision Inc Page 32 CompactLink C Library Manager Examples PARAMETER VCMRNEG PARAMETER VCMRPOS PARAMETER VSATNEG PARAMETER VSATPOS PARAMETER BUFFERTOL PARAMETER GAIN2TOL Define variables VIN 0 VMID 0 VSUPP 0 VOUT 0 First measure mid rail voltage by following procedure 1 Turn off all pins 2 Enable the 100R pseudo ground resistor on an input 3 Measure the voltage at this pin and save Turn all pins off INPUTS Enable 100R ground R on INV1 and no feedback R SET FEEDBACK TO OUTPUT1 INV1 FB_OFF GND_100R Measure the voltage on INV1 to use for rest of test VMID VOLTAGE INV1 Measure the supply voltage VSUPP VOLTAGE V Set up pins for op amp 1 INPUT_INV INV1 INPUT_NINV NINV1 OUTPUT OUTPUT1 INPUTS NINV1 Test op amp 1 in open loop mode DO TEST_OPEN_LOOP Test op amp 1 in buffer mode unity gain DO TEST_BUFFER Test op amp 1 in gain of 2 mode DO TEST_GAIN2 Set up pins for op amp 2 INPUT_INV INV2 INPUT_NINV NINV2 OUTPUT OUTPUT2 INPUTS NINV2 Test op amp 2 in open loop mode DO TEST_OPEN_LOOP Copyright 2007 B amp K Precision Inc Page 33 CompactLink C Library Manager Examples Test op amp 2 in buffer mode unity gain DO TEST_BUFFER Test op amp 2 in gain of 2 mode DO TEST_GAIN2 Set up pins for op amp 3 INPUT_INV INV3 INPUT_NINV NINV3 OUTPUT OUTPUT3 INPUTS NINV3
51. nge the voltage on the input pin by the defined voltage Response Commands Functions COMPARE Compare the voltage current with a specified value using a given tolerance VOLTAGE Return the voltage at a pin Other Commands INPUTS Define the inputs of the IC under test SET FEEDBACK TO Configure the B amp K 570A feedback network 5 2 1 Using the DRIVE commands The DRIVE ABSOLUTE command is the most common command for analog component stimulus and it applies the specified voltage to the input pin The DRIVE INCREMENTAL command is slightly different this command measures the voltage at the pin before changing it by the specified amount so you do not need to know the original voltage For example when checking the gain of a circuit the actual voltages used are not that important as it is the ratio of them that will give you the gain Note that the following 2 program segments will give the same result Copyright 2007 B amp K Precision Inc Page 25 CompactLink C Library Manager Examples DRIVE ABSOLUTE INPUT TO VOLTAGE INPUT 0 1 DRIVE INCREMENTAL INPUT BY 0 1 The first command measures the input voltage and then increases it by 0 1V The second command does this internally without first measuring the voltage 5 2 2 Using parameters Parameters are constants used only in B amp K 570A tests They are initialized with values in the Device Information window This allows many devices with different specification
52. ompactLink C Library Manager Reference number pin expression only valid for B amp K 570A programs Expecting string expression NEWLINE or CHR after DISPLAY command Expecting THAT before pin name number list or group Expecting TO after pin name or number Expecting TOLERANCE after target compare expression Expecting WITH after actual compare expression Expecting WITH after pin list or group Expression has more than 4 bracket levels Extra Hexadecimal number greater than FFFF Input pin x defined already Invalid character number Invalid pin list Invalid procedure name in pin Invalid variable name Missing END DO Missing END IF Missing END PROCEDURE be an expression for B amp K 570A programs There is no valid argument for the DISPLAY command Invalid SYNTAX in CHECK THAT command Incorrect syntax in DRIVE command Invalid SYNTAX in COMPARE command Invalid SYNTAX in COMPARE command Incorrect syntax of DRIVE command The expression is complex too There was an additional closing bracket You are attempting to specify a hexadecimal number greater than FFFF The given pin number is already used in the INPUTS command pin list Pin number can only contain characters 0 9 Syntax error in pin list The procedure name contains invalid characters The variable name contains invalid characters The DO WHILE command did not match u
53. ore than once in pin group XXX Pin group XXXX already defined Pin group XXXX has more than 8 pins with a corresponding END PROCEDURE There are too many pins in the pin list The loop construction you have used is too complex and or requires too much memory The IF ELSE END IF construction you have used is too complex and or requires too much memory The pin list in the given context can have a maximum of 8 pins The already variable parameter The number you are entering is too small or too large or is of invalid format procedure name exists for a procedure or The specified parameter already exists The specified parameter does not exist You have used the specified pin more than once in the CHECK THAT command The given pin is included twice or more in the pin list The specified pin does not exist in the device pin out The given pin is defined more than once in the pin group definition The given pin group name already exists A pin group can have a maximum of 8 pins Copyright 2007 B amp K Precision Inc at the correct location or remove the PROCEDURE statement Normally a pin list can have 8 pins but in some circumstances e g LINKED function this limit may be less Use the correct no of pins for the command function Change the structure of your program to reduce the number of nested loops to 5 or less Change the structure of your program to reduce the nestin
54. p with a corresponding END DO The IF command did not match up with a corresponding END IF The PROCEDURE command did not match up Copyright 2007 B amp K Precision Inc the pin name directly Add a valid argument Use correct syntax Use correct syntax Use correct syntax Use correct syntax Use correct syntax Split the expression onto 2 or more lines using intermediate variables Use correct syntax Correct the number or specify in decimal Define each pin only once in the INPUTS command Use only digits in the pin number Use correct syntax Procedure names must begin with a letter and can contain only letters numbers and underscores Variable names must begin with a letter and can contain only letters numbers and underscores Add an END DO statement at the correct location or remove the DO WHILE statement Add an END IF statement at the correct location or remove the IF statement Add an END PROCEDURE statement Page 46 CompactLink C Library Manager Reference More than X pins in pin list More than 5 nested DO WHILE loops More than 5 nested IF constructions More than 8 pins in list Name XXXX already in use Number out of range exponent must be between 99 and 99 Parameter XXXX already defined Parameter undefined XXXX Pin X already defined Pin X defined more than once in pin list Pin X is undefined Pin defined m
55. pe of logic devices the output logic levels depend purely on the input logic levels so your program will probably proceed as follows e Specify the inputs of the IC under test with the INPUTS command e Apply the desired logic levels to the inputs with the DRIVE command e Check that the outputs respond correctly with the CHECK THAT command When writing a test for a combinational logic device ensure that you cover all possible states to get the best test possible For example if you are testing a 4 input gate you will need 16 states to cover all combinations of the 4 inputs This is best achieved with a loop using the DO WHILE construction to repeat the test with different input states 5 1 2 Sequential devices counters registers latches Sequential devices are far more complex and in fact the vast majority of digital devices are sequential The device normally has one or more clock inputs and the outputs depend on both the current inputs and on the history of the inputs so you cannot just apply inputs and check the output response For example a 4 bit counter can count from 0 to 15 before starting again at 0 If you just apply a pulse to the clock input using the PULSE command this will advance the outputs by 1 state but unless your program knows the initial state you cannot check whether the new state after the clock pulse is correct To deal with this problem there are a number of techniques depending on the type of
56. purchase the CompactLink C Library Manager software 2 1 What is CompactLink CompactLink C Library Development Manager is designed to allow you to add functional tests for new ICs to the library of your B amp K model 570A or 575A IC tester The heart of CompactLink is PLIP which is a high level descriptive test programming language optimized for generation of both analog and digital IC test programs Programs are compiled into machine code making them fast and compact and can be freely added to the model 570A and 575A libraries CompactLink contains a sophisticated test program debugger which allows you to check that your program executes correctly before including it in your library It is very important to understand that there are two separate functions involved in adding an IC to the user library Firstly the IC number size pin out power supply pins and other information must be defined which will be described in detail later After this process is complete you can then write a functional test program which is the second main function of CompactLink Copyright 2007 B amp K Precision Inc Page 3 CompactLink C Library Manager Writing test programs 3 Getting started This section is intended to get CompactLink up and running quickly Please read carefully before using for the first time Detailed descriptions of the meaning of the various parameters and device entries will be given later on in the manual 3 1 Che
57. r Program cceseeseeeesereeeeseeceeeeseneeseneneeeeneenerees 17 4 9 Setting breakpoints cc eeeeceeeeeeeeeeeeeeeeeeeeeaeeeeeeeteaeeeeeeetsaeeeeeeeee 18 4 10 Debugging techniques ec eeceeeesseeeeesnneeeeeneeeeeneeeeseneeeeenaees 19 4102 sGompiler errors 228 ian ee eke oie ae 19 4 10 2 Run time errors eere ele sie eae dees 19 4 10 37 LOGICALS OMS 34s ssnc2 ecrire eeren raa ea e a EER 19 5 Some common programming CONCEPIS ceeceeeeeeeeeeseeeeeeeeseaeeteaeeeee 22 Copyright 2007 B amp K Precision Inc i CompactLink C Library Manager Contents 5A Digital test programming ssssseseresereresrererrnnnnrrnnnrrnnenrnnarennneennna 22 5 1 1 Combinational devices gates buffers multiplexers 23 5 1 2 Sequential devices counters registers latches 23 5 1 3 Tri state devices buffers DUS drivers 24 5 1 4 LSI and Complex GeVICES ee eeceeeeeeeeeeeeneeeeneeteneetenteeeneeteaes 24 5 2 Analog test ProgrammMing cesccceseseeeessneeeeeeneeeeseneeeeeeneeeesnnees 25 5 2 1 Using the DRIVE COMMANAS cceeseceeeeneeeeeeneeeeeeneeeeennees 25 5 2 2 USING Parameters ec eeeeeceeeeseceeeeseneeneneeeeeeseenenenseeenenenees 26 6 7400 digital IC test program for the B amp K 575A ccccccesceesssseeeeeeees 27 6 1 Defining the IC inputs 0 0 ecceeeeeeeeneeeeneeeeeeeseaeeseeeteaeeteaeeseaeeeeaes 27 6 2 Simple test for
58. r in a folder name You cannot set more than 3 breakpoints in your program You are about to permanently delete the given device You are about to permanently remove the specified test The USER library generate operation was cancelled by the user The USER library file generation failed due to an error Copyright 2007 B amp K Precision Inc Action Choose a different name Remove one of the other breakpoints and set the new one Click Yes to delete or No to abandon the operation Click Yes to delete or No to abandon Re generate the USER library files Identify and correct the error then re generate the USER library files Page 41 CompactLink C Library Manager Reference Cannot set breakpoint on this line Error syntax help for XXXX not found Error syntax help for this command not found Error adding new test Error copying test Error loading device Error loading test Error saving device Error saving test Feature not implemented Memory dump size must be between 1 and 12k 3000H bytes Must be numeric value from X to Y No devices to build Please enter a test name Program not built or has errors cannot set breakpoint Search text was not found Source has been changed do you wish to save the changes The selected line is either a comment or has no executable code present e g SET pin group command The word under the cursor has no matching syntax
59. ram and full speed with the Execute button and the program will stop at the first breakpoint encountered To set a breakpoint do the following e Click on the line where you want to set the breakpoint e g B A D e Choose Debug Toggle Breakpoint from the menu or press F9 or right click and choose Toggle Breakpoint from the popup menu The selected line will be bulleted to indicate the breakpoint and an entry will be made in the Break debug window on the right e Click H Reset to reset the program back to the start then click or Execute to run the program You will see that the program stops at the selected line e You can now examine the variables to confirm that the program has executed correctly Copyright 2007 B amp K Precision Inc Page 18 CompactLink C Library Manager Writing test programs Note that the Break debug window includes two special breakpoints which are enabled by default but you can turn them off if you wish e Break on first FAIL This can be useful when writing IC tests since you can run the program until the test fails allowing you to quickly home in on problems in your program e Break at end of test This causes execution to stop at the end of the program This allows the final state of all program variables to be examined before the test completes To remove a breakpoint click on the line where the breakpoint has been set and choose Toggle Breakpoint again to remove it 4 10 Deb
60. re readable In addition related sets of pins can be defined as a pin group which can then be referred to by its group name This again greatly improves the readability and understanding of a test program See the SET command for further details of this facility Copyright 2007 B amp K Precision Inc Page 12 CompactLink C Library Manager Writing test programs The compiler generates binary data which can be executed in stand alone form by the integral debugger or combined into library files for use with your B amp K 570A or B amp K 575A products The product software contains advanced run time error checking traps to ensure that execution errors e g divide by zero stack overflow out of range voltages etc do not cause system crashes Any PLIP program contains a combination of COMMANDS FUNCTIONS and VARIABLES the meaning of which will become clear if you work through the development example for the 7400 IC given below 4 2 Opening the test development and debugging window The first step in writing any test program is to add a new IC to the library and add a new test for it as follows Refer to section 3 9 and add a new device to the library Enter the name TESTDEV in the name field e Note that by default the device has 14 pins which have the default names PIN1 PIN2 etc e Click on the B amp K 570A or B amp K 575A test tab depending on the product you wish to connect e Enable the Include device in library and
61. riable name or define the variable Use a name with up to 30 Page 48 CompactLink C Library Manager Reference more than 30 characters long 10 4 PLIP warning messages Message Command XXXX is only valid for XXX products ENDDO is incorrect syntax assuming END DO ENDIF is incorrect syntax assuming END IF ENDTEST is incorrect syntax assuming END TEST Extra characters ignored No END TEST assumed one Test end already defined Meaning The specified command is not valid for the target product for this test Incorrect syntax of END DO command Incorrect syntax of END IF command Incorrect syntax of END TEST command There is some additional unnecessary text in the program There is no END TEST command in your program More than one END TEST characters Action Use the correct command for the target or change the target Use correct syntax Use correct syntax Use correct syntax Use the correct syntax Include an END TEST command at the correct location Use only 1 END TEST ignored statement in program 10 5 PLIP run time error messages Message Divide by zero Bad number value Stack overflow Bad random seed Bad pin number Meaning Division by zero is impossible The result of the expression is not legal for the operation being performed For example for the ROUND function the number of decimals places must be
62. s given There is a missing comma in the list of arguments for the DISPLAY command There is a missing closing square bracket in the ARRAY statement The string in the DISPLAY command has no terminating double quote character The specified character usually a closing bracket was not found after the expression or function The specified character usually an opening bracket was not found in the expression There is a missing after the ARRAY statement Invalid syntax in SET pin group command Invalid SYNTAX in CHECK THAT command There is a missing after the variable definition The specified pin group does not have a closing angle bracket gt Incorrect syntax of DRIVE INCREMENTAL command The compiler was expecting an expression but none was found Logic level missing the given Compiler expecting a pin name or number The pin number can only Copyright 2007 B amp K Precision Inc Correct the syntax of the pin list Correct the syntax of the pin list Correct the syntax of the pin list Use correct syntax Use correct syntax Use correct syntax Use correct syntax Use correct syntax Use correct syntax Use correct syntax Use correct syntax Use correct syntax User correct syntax Use correct syntax Use correct syntax Enter LOW or HIGH as appropriate Use a valid pin name or number Check the Device Information window for correct pin out For B amp K 575A tests use Page 45 C
63. s to share the same test for example in a voltage regulator test parameters could be used for the output voltage tolerance minimum and maximum currents This allows the same test to be used for voltage regulators with different output voltages To specify parameters enter PLIP code in the Parameters box in the Device Information window for the device under test For the above example the parameters might be entered as follows MIN CURRENT 0 MAX CURRENT 0 1 SPEC_VOLTAGE 5 SPEC_TOL 0 05 When the test is compiled the given parameters are initialized to the values entered which can then be used in your program rather than actual numbers allowing your test to be re used Similar parameters can be used for test voltages and currents in most types of analog tests For example the forward voltage drop for a Schottky type diode will be less than a normal silicon diode A parameter can be used to set the expected voltage drop which can then be used in your test so that the same diode test can be used for both types of diodes Copyright 2007 B amp K Precision Inc Page 26 CompactLink C Library Manager Examples 6 7400 digital IC test program for the B amp K 575A Now we are ready to write a complete IC test program In this example we will describe how we would write a PLIP test program for a 7400 QUAD NAND GATE IC and in this way introduce you to the concepts involved in test programming The program can be executed
64. saturation voltages and tolerances This allows the same test to be used for different quad op amp devices e The INPUTS command with no arguments is used to turn off all output drivers e Variables are used for pin names so that procedures TEST_OPEN_LOOP TEST_BUFFER and TEST_GAINZ2 can be used for all 4 op amps in the package e In the open loop test a ground resistor is used to establish a mid rail voltage on the inverting input The non inverting input is then driven by a small voltage either side of this to make the output respond The DISPLAY command is used to show the output saturation voltages achieved The outputs are tested against the saturation voltage parameters then the COMPARE command is used to force a test fail if the voltages are incorrect e In the buffer test a feedback resistor is used to configure the op amp to have unity gain The non inverting input is then driven by a gradually increasing voltage and the output is checked at each stage using the COMPARE command e In the gain2 test the feedback network is used to configure the op amp to have a gain of 2 The non inverting input is then driven by a gradually increasing voltage and the output is checked at each stage using the COMPARE command Note that the difference between the input output voltages and mid rail voltage is used in the comparison LM324_570A Test for LM324 quad op amp on B amp K 570A Tested in open loop unity gain and gain of 2 Defi
65. se of a test already in the list For example many op amps are pin compatible and have only slight functional differences so they can share the same test program If you want to specify an existing test find the test you can use the Find box to quickly locate a test and click Select to associate this test with your new device Often you will want to add a new test for a new device To do this there are 2 alternatives e If there is a PLIP test in the library that is similar to the one you want you can use Copy Test to make a copy of it with anew name To do this click Copy Test select the copied test and click Rename to give the test your desired name e f you want a complete new test click Add New to add a new test select it then click Rename to change the name Copyright 2007 B amp K Precision Inc Page 9 CompactLink C Library Manager Writing test programs In all cases the preview window displays the source code for the selected test to help you choose a suitable test for your device To delete a test select the test and click Delete but note that you cannot delete a test that is allocated to a device 3 13 Developing a functional test Test programming and debugging is a complex subject which we will discuss in detail later However to see the required steps follow the procedure below If you have not already done so add a new device to your USER library as described above e Define the pin names for
66. sh to Add or Delete pins with the buttons if the device you are adding has a different number of pins To change the pin name click on the pin and enter the new name maximum 8 characters Now you need to choose the product s with which the new device is to be tested For example if you intend to add this device to the B amp K model 575A library open the B amp K 575A Test tab and click Include device in B amp K 575A library You can then set the other entries as you wish You must enable the functional test checkbox 3 10 Viewing an IC There are several ways to select a device for viewing Click on a device in the list and click Device Edit on the menu Right click on a device in the list and choose Edit from the popup menu Double click on a device in the list Enter all or part of the device name in the Find Device box then press the Enter key In this Edit Device Definition screen you can see the name and function of the device along with 3 tabs for further device information In the Device Information tab you can see the pin out and device specific information such as the package thresholds and output types The other tabs contain product specific information 3 11 Copying editing an IC You can copy an existing device into your USER library which is then available for you to edit As an example of this carry out the following steps e Return to the Library Review screen by clicking Cancel if you are still looking at a
67. the new device since they are required for the functional test Enable the device for the chosen target product as described above Enable the functional test for the device target combination Click Select Test and add a new functional test for the device Click Develop Test to enter the functional test development and debugging window e In the Source Program window enter the PLIP code for the test full details later e Use the toolbar Build Test button to compile the test and fix any compilation errors Connect up your chosen hardware B amp K model 575 or 570 tester e Choose Tools Configure Hardware and specify the type of hardware interface to be used e Use the toolbar Send Test button to download the compiled test to the target hardware e Use the debugging commands and windows to step though the test and confirm that it executes correctly e Once complete save the test and close the debugging window Generate a new set of USER library files containing the new test 3 14 Deleting an IC from the USER library There are two ways to delete a device from your USER library e Select the device to be deleted in the Library Review screen by clicking on it or by entering all or part of its name in the Find box e Right click on the device and choose Delete or e Choose Device Delete from the menu Once you have deleted a device there is no way to restore it except by re entering all its information You should make regular backups of
68. tional test is enabled for the device on this target product Voltages above this value are defined as valid HIGH logic levels Ticked if the device is specified for testing on this target product Ticked if this device is to be included in the target search IC identifier function If the test takes a long time you may want to exclude it to speed up the search Ticked if the device inputs should be checked for excessive loading This is the normal case but some good ICs have excessive loading e g Some ULN series ICs Date of last compilation of the test Automatically updated by the system Date of last modification to Automatically updated by the system Voltages below this value are defined as valid LOW logic levels Alphanumeric name for the device Ticked if one of more device outputs is open collector Ignored for B amp K570A Ticked if one of more device outputs is open emitter Ignored for B amp K570A Package type of the device When 2 or more devices share the same test the tests can be configured by using parameters to initialize variables in the test e g to use different voltages for each test Copyright 2007 B amp K Precision Inc Limits 100 characters max 10V to 10V 10V to 10V 20 characters max Unlimited Page 40 CompactLink C Library Manager Reference Pin out Power Supply Switch threshold Technology Test Version Tri state Use Number Version device This field
69. ugging techniques Debugging programs is a complex skill that requires practice and experience Nevertheless there are some ground rules you can follow to help you avoid errors in your programs There are 3 types of errors that can occur in your program 4 10 1 Compiler errors Compiler errors occur if you mistype text or use incorrect syntax These are easily fixed as the PLIP compiler provides error messages and the syntax guide helps you get the command right 4 10 2 Run time errors Run time errors are caused by illegal operations such as divide by zero which cannot be detected by the compiler as it has no knowledge of the intended values of variables in your program For example if your program includes the line GAIN OUTPUT INPUT you should ensure that the value of INPUT cannot contain zero This could be done simply as follows IF INPUT lt gt 0 GAIN OUTPUT INPUT END IF If a run time error occurs program execution will stop and the cause of the error will be displayed in the Result window at the bottom right 4 10 3 Logical errors These are the most common type of errors in the program and also the most difficult to find The following techniques will help e Single step your entire program This can be laborious but it will ensure your program executes according to plan Use the Variables window and Copyright 2007 B amp K Precision Inc Page 19 CompactLink C Library Manager Writing test programs
70. variable defined in your program The text string can have a maximum of 30 alphanumeric characters and can contain underscores It can also refer to the pre defined array using the string ARRAY Copyright 2007 B amp K Precision Inc Page 38 CompactLink C Library Manager Reference 9 Troubleshooting and support If you suspect your CompactLink software is not functioning correctly contact B amp K Precision with full details of the apparent problem We will respond as soon as possible with advice Copyright 2007 B amp K Precision Inc Page 39 CompactLink C Library Manager Reference 10 Appendices 10 1 Library parameter reference This section contains detailed information about the meaning of the various All the device information entries for the CompactLink device library parameters are listed in alphabetical order with a brief explanation Entry Class Current test Date External Comps Function Functional test High threshold Include device in XXX library Include in Search Input Load Check Last Compiled Last Modified Low threshold Name Open collector Open emitter Package Parameters Explanation Functional classification of the device The currently selected functional test for the device Date of last change to device Not used by system Ticked if the test for this device requires external components e g monostable ICs Brief description of device function Ticked if the func

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