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User Manual: Teseq NSG 3040 4kV Conducted

1. NSG 3040 EMC test system 8 8 5 Test duration The Test duration setting enables to set the total test time i e the time period during which the SOW burst packages are sent out Changing the setting is easy touch the Test duration value box on the param eter window 120 in the example to set the test duration time A red frame is displayed around the field The duration time may be entered using the wheel or the keypad Touch the units button s in the example to set the time unit Selectable time units are s min h and Cont continuous 8 8 6 Phase synchronization Touch the Synch Asynch button Asynch in the example to activate deactivate the synchronization of test pulses to the EUT mains frequency When this button is set to Asynch the phase value button in the example will display When this button is set to Synch the user must also set the phase value To set the phase value touch the phase value button A red frame is displayed around the field The phase value may be entered using the wheel or the keypad The value is in degree units and may range from 0 to 359 In Phase synchronization mode Synch the first pulse of a group will be synchro nized with the set phase angle of the EUT mains frequency The phase angle synchronization has priority over a possibly conflicting Repetition time setting 8 8 7 Derating Some parameter combinations will not be accepted due to the power limitation of pu
2. NSG 3040 EMC TEST SYSTEM USER MANUAL More Application Information and Pricing available at 250 Technology Way sales testworld com Rocklin CA 95765 1 855 200 TEST 8378 Click to go www TestWorld com TASEO 601 279F Advanced Test Solutions for EMC NSG 3040 EMC TEST SYSTEM USER MANUAL CONTENTS 2 1 3 1 3 2 33 3 4 3 5 3 6 4 1 4 2 4 3 4 4 4 5 4 6 4 7 5 1 5 2 53 5 4 6 1 6 1 1 6 1 2 6 1 3 Explanation of symbols Introduction General description Standards and applications Burst test Combination wave test Mains quality test Magnetic fields with mains frequency Pulsed magnetic fields Slow Damped Oscillatory Wave NSG 3040 SOW only Safety instructions General nstallation nstallation of an EUT power switch Applicable safety standards Test execution User warnings Generator Dangers concerning the EUT First steps nstallation of the NSG 3040 system Connecting the test system to the ground reference plane ounting in a 19 rack Rear ground brackets INA 165 Mainframe description Front panel EUT output High frequency ground terminal Surge or SOW output 10 10 12 12 13 13 14 14 14 16 16 17 18 18 19 20 21 22 23 24 24 24 25 25 25 26 27 6 1 4 6 1 5 6 1 6 6 2 6 2 1 6 2 2 6 2 3 6 2 4 6 2 5 6 2 6 7 7 1 1 2 7 2 4 E22 123 7 24 Tee 8 8 1 8 2 8 2 1 8 2 2 8 2 3 8 2 4 8 2 5 8 3 8 3 1 8 3 2 8 3 3
3. 82 8 8 3 Output impedance One of the unique features of the NSG 3040 SOW is the selectable output impedance source impedance of 200 Q and 150 Q According to standard 200 is the fixed output impedance while the 150 Q value represents the actual impedance of cables twisted pairs According to IEC 61000 4 18 Ed 1 1 2011 chapter 6 1 3 Impedance value the output impedance of the Slow oscillatory wave generator has been fixed to 200 out of compatibility reason with other standards although the actual impedance of the cables twisted pairs is nearer to 150 Q Selecting 150 Q enables manufacturer to test their equipment under conditions which reflect actual reality conditions providing more accurate results and possibly a competitive advantage 8 8 4 Timing parameters To change the different timing parameters Oscillation Frequency Burst Fre quency Burst Duration Repetition Time touch the corresponding box with the preset value An additional windows opens which enables to change the value within the limits given in the table above The new value may be entered by touching the parameter box and then by using the wheel in combination with the sensitivity keys 1 10 100 step or the keypad Exit by clicking the Ok button to save your changes or cancel to exit without Burst Duration 2 9 Repetition Time a G saving Oscillation Frequency 100 KHz Burst Frequency 40 s
4. Burst wave shape and timing definitions tr 5ns 30 tp 50 ns 30 into 50 Q tp 50 15 ns 100 ns into 1000 Q NSG 3040 EMC test system 8 3 3 Burst parameters window Burst window Volt at 200 V Burst Time 15 Frequency 5 v abil 300 ias p a Be 120 z 1 ae Burst parameter setting window 8 3 4 Voltage Touch the Polarity button ALT in the example to select test polarity Polarity values are positive POS negative NEG or alternating ALT On odd pulse number there will be one pulse less in negative then in positive Positive pulse will be first executed Touch the Voltage button 200 V in the example to enter the test voltage A red frame is displayed around the field The voltage value may be entered using the wheel or the keypad 8 3 5 Frequency Touch the Frequency button 5 in the example to set the test frequency A red frame is displayed around the field The frequency value may be entered using the wheel or the keypad Touch the units button KHz in the example to set the frequency unit Frequency values are Hz and KHz 8 3 6 Phase Touch the Synch Asynch button Asynch in the example to activate the syn chronization of test pulses to the EUT mains frequency TASEO Advanced Test Solutions for EMC 59 60 When this button is set to Asynch the phase value button in the example will display When this button is se
5. 136 136 139 140 142 142 144 146 148 149 149 150 151 153 154 156 TASEO Advanced Test Solutions for EMC WARNING Lethal danger from high voltages and the risk of radiating illegal electromagnetic interference This system must be used only for EMC test purposes as specified in these operating instructions The NSG 3040 must be installed and used only by autho rized and trained EMC specialists Personnel fitted with a heart pacemaker may not operate the instrument and must not be in the vicinity of the test setup while it is in operation When the system is used in conjunction with options accessories or other equipment the safety instructions concerning those devices must also be observed NSG 3040 EMC test system 1 EXPLANATION OF SYMBOLS E Please take note of the following explanations of the symbols used in order to achieve the optimum benefit from this manual and to ensure safety during operation of the equipment The following symbol draws your attention to a circumstance where non observation of the warning could lead to inconvenience or impairment in the performance Example This connection must not be confused with the Equip ment under Test EUT power input The following symbol draws your attention to a circumstance where non observation of the warning could lead to component damage or danger to the operating personnel Example Never connect or disconnect the EUT while the test
6. MaterController via Interlock plug System Interface cable TASEO Advanced Test Solutions for EMC 117 118 Technical specifications INA 6502 Input voltage 0 to 250 VAC not suited for DC voltages Output voltage 4 steps 0 40 70 80 Accuracy 5 Voltage change with load 100 output O to 16 A less than 5 80 Output O to 20 A less than 5 70 Output O to 23 A less than 5 40 output O to 40 A less than 5 Output current capability at 230 V input voltage 16 Arms at 100 output 20 Arms at 80 output 23 Arms at 70 output 40 Arms at 40 output Voltage selection Software driven EUT power on off function Front panel switch with on indicator software driven from NSG 3040 Fuse 16 A slow blow Connectors Harting type HAN3A Power Supply Selectable 100 110 V 220 240 V 15 VA Size 460 x 200 x 160 mm Weight 15 kg approx Output cable length 2 meter Input cable NSG 3000 standard cable to be used Control cable 2 meter 25 way sub D twisted pair shielded included in delivery Parts description Plug X3 Remote TEST and EUT power off with shorting plug Allows to connect external door switch or equivalent Interrupts the 24 V supply of the circuit breaker contactor which switches EUT supply on off The information will be transmitted to NSG 3040 which will stop the test Plug X2 NSG 3040 system interface OUT to be terminated by interlock plug or to be linked to another accessory to X1 plug NSG 30
7. and a switch which provides the actual path for the packet in and out of the gateway The gateway address is usually set at 0 0 0 0 Touch the Gateway button to enter the gateway address Enter the gateway address using the virtual keypad and confirm with Enter Port Network ports can be either physical or virtual connection points The NSG 3040 has a physical Ethernet port that allows it to be connected to a PC or router The port address for the NSG 3040 should be set to 1025 Touch the Port button to enter the port number Enter the port number using the virtual keypad and confirm with Enter MAC address Media Access Control MAC technology provides a unique identification and access control for devices on an IP network This address cannot be changed Media Access Control assigns a unique number the MAC address to each network adapter TASEO Advanced Test Solutions for EMC 41 42 7 2 4 MONITORING screen Monitoring EUT Supply Voltage Variac NA EUT Power IN NA EUT Supply Frequency Test Action m at EUT Fail Input op 0 0 Hz Monitoring window Touch the Monitoring button to view EUT power input parameters and to control test activity and EUT power input in the event of EUT failure EUT Supply Voltage EUT Supply Frequency In case a CDN 304x series CDN 306x series or an INA 650x is connected to the NSG 3040 the EUT Supply Voltage field displays the actua
8. on the right side of the screen to scroll through the tests Touch the button to the left of the test name to select it A red border is dis played around the selected test Touch the OK button to load the test and return to the test parameter window Touch the Delete button to delete a saved test A window asking the user to confirm or cancel this action will be displayed Touch OK to delete the file or Cancel to cancel this action NOTE Once a test has been deleted it cannot be restored Load User test FlashDisk UserTest EFT IEC61000 4 4 2004 LEVEL2FOR DATA LINES EFT IEC61000 4 4 2004 LEVELI FOR DATA LINES EFT IEC61000 4 4 2004 LEVEL3 FOR DATA LINES EFT RAMPING TEST EFT LONGTERM TEST LEVEL2 COUPLING ON L1i PE EFT Load user test window NSG 3040 EMC test system 8 2 2 LOAD STANDARD TEST 53 The NSG 3040 includes all necessary test libraries corresponding to the latest editions of the IEC basic standards from the IEC EN 61000 4 x series They conform to many standard derivates and product standards Additionally some corresponding ANSI IEEE standards as well as a selection of generic and product standards are available Depending on the selected pulse the appropriate IEC standard tests can be selected Following standard tests are included in the SUI Burst IEC 61000 4 4 1 Phase power lines level 1 up to level 4 5 KHZ 1 Phase power lines level 1 up to level 4 100
9. 8 3 4 8 3 5 8 3 6 8 3 7 8 3 8 8 3 9 Burst output ndicator LEDs Touch screen and user interface Rear panel nstrument supply EUT power input DC EUT input Ground connection point System interface connector 25 pin D sub Synchro Bus system The standard user interface SUI ain menu System window GENERAL settings EQUIPMENT screen COMMUNICATION screen ONITORING screen Updating SUI software via the SD card Parameter setting window The red menu bar The bottom bar Load user test Load standard test Save test Keypad Show graphic Burst generator setting Test configuration with power line coupling Test configuration with external coupling Burst parameters window Voltage Frequency Phase Coupling Burst time Repetition time 8 3 10 Test duration 27 27 28 28 28 29 31 31 31 32 34 35 36 36 39 40 42 43 47 47 52 52 53 56 56 57 57 58 58 59 59 59 59 60 61 61 61 8 3 11 Burst generator technical data 8 3 12 Derating 8 4 8 4 1 8 4 2 8 4 3 8 4 4 8 4 5 8 4 6 8 4 7 8 4 8 8 4 9 8 5 8 5 1 8 5 2 8 5 3 8 5 4 8 5 5 8 5 6 8 5 7 8 5 8 8 5 9 8 6 8 7 8 8 8 8 1 8 8 2 8 8 3 8 8 4 8 8 5 8 8 6 8 8 7 9 9 1 9 2 9 3 9 4 Combination wave Surge parameter setting Test configuration for power line coupling Test configuration for external coupling Voltage Impedance Phase Coupling Repetition time Test duration Surge generator technical data Dips interrupts an
10. 900 g approx 14 8 Cables plugs and adapters 14 8 1 Calibration adapters INA 3237 BURST EFT calibration adapter to former INA 6561 connect NSG 3040 and CDN 3061 series second edition and later to calibration terminator attenuator CAS 3025 TASEO Advanced Test Solutions for EMC 149 INA 3236 HV plug adapter set for NSG 3000 series former INA 6560 Surge out to safety Banana 1 plug to RED banana 1 plug to Black banana Required for surge pulse calibration safe and reliable connection to mea suring probes Max applicable surge voltage is 10 kV Can also be used to build injection probe to couple surge pulses to shielded datalines and EUT s housings etc INA 3233 Adapter IEC 320 to banana plugs To former INA 6554 connect EUT with banana plugs to NSG 3040 or CDN 3061 series 14 8 2 Test adapters INA 3230 Adapter IEC 320 to Schuko plug To former INA 6550 connect EUT with Schuko plugs to NSG 3040 or CDN 3061 series 3040 or CDN 3061 series INA 3231 Adapter IEC 320 to Swiss plug To Gg former INA 6551 connect EUT with Swiss plug to NSG NSG 3040 EMC test system INA 3232 former INA 6555 14 8 3 Various cables and plugs INA 6542 INA 6543 INA 6544 Adapter IEC 320 to French plug To connect EUT with French plugs to NSG 3040 or CDN 3061 series EUT power IN cable for NSG 3000 series and accessories Mains plug adapter for EUT connection to NSG 3040 and CDN
11. Explanation of Burst frequency Burst duration and Repetition time parameters NSG 3040 EMC test system 8 8 2 Coupling Touch the Coupling mode button in the top row Surge output in the example above to select Surge Output Manual CDN or EUT Power Output Surge Output Surge Output must be selected if an external capacitive coupling clamp e g CDN 3425 is connected to the NSG 3040 SOW Manual CDN Manual CDN must be selected if an external manual coupling decoupling device is connected to the NSG 3040 SOW The factory setting for Manual CDN is the same as for Surge Output EUT Power Output With EUT Power Output setting the Slow Damped Oscillatory pulses are directly applied on the EUT power output plug on the front panel of the NSG 3040 SOW Touch the coupling line selection field in the example to display the cou pling selection window Touch the individual High output coupling line buttons L and N in the example to select an open or closed relay Touch the individual Low output coupling line buttons PE in the example to select an open or closed relay Touch OK to enable the coupling selection and close the window Touch Cancel to close the window without saving the coupling selection Touch Show Graphics to display a graphical example of the coupling selection o i a w E ee Coupling selection window TASEO Advanced Test Solutions for EMC 81
12. This button displays the EUT input power status OK Touch the Ok button to save changes and return to the system window 7 3 Updating SUI software via the SD card To change the SUI software first switch off the generator and remove all power cords and cables Open the top housing cover of the generator as described below that it is turned OFF and disconnected from all power o WARNING Before opening the generator make sure and signal cables TASEO Advanced Test Solutions for EMC 43 44 To open the NSG 3040 the user must first remove the sides panels Each side panel has 4 snap fixtures which will Separate when outward pressure is applied 1 Pull outward on the indentation in the front of the side panel A blunt tool which will not scratch the paint on the panel may be used 2 Pull outward to separate the panel from the snap fixtures 3 Remove the upper screws on both sides of the generator cover 4 Remove the NSG 3040 cover The SD card slot is located at the right front of the generator in back of the front panel 5 Press the SD card to release it Remove the card from the slot To install a new SD card proceed to step 7 6 To download new software from a PC to the SD card insert the card in the SD port of the PC and copy the software to the SD card The file name must remain SUIZOOOAP EXE Remove the SD card from the PC 7 Insert the SD card in the NSG 3040 Follow steps 1 4 in reverse t
13. access to its power supply switch NOTE In case the test system is being used without an TASEO Advanced Test Solutions for EMC 24 NOTE Your NSG 3040 generator has been delivered with a correctly rated power supply cable If the cable needs to be replaced the user needs to make sure the new cable is suited for the rated supply voltage and current 5 2 Connecting the system to the ground reference plane For burst tests the generator must be placed on a ground reference plane which is connected to ground A good high frequency ground connection between the test system and the ground reference plane GRP is absolutely essential for performing burst tests correctly Connect the ground terminal on the front panel of the NSG 3040 to the ground reference plane using the link and bolts supplied If a CDN is connected please refer to section High frequency ground terminal 5 3 Mounting in a 19 rack When the NSG 3040 test system is combined with other equipment it can be useful to mount the instrument in a 19 rack The unit is 19 wide and 5U in height An optional rack mount INA 166 kit is available 5 4 Rear ground brackets INA 165 Rear ground brackets are optionally available to position the NSG 3040 securely without damaging the connectors when it must be placed with the rear panel on the floor with easy access to the touch screen These brackets guarantee a solid ground connection to the GRP The stable housi
14. acknowledged then power to the EUT is restored Activation of the interlock function is achieved without the help of micropro cessors and software This ensures that the safety feature is not affected or hindered in the event of a program crash 9 2 Trigger to scope output signal Between Pin 18 hi and Pin 2 8 15 20 low Inactive state at 24 V in the active state lt 2 4 V Note The trigger signal has generally a duration of approx 50 us e g for surge testing In case of bursts its width shall change according to the length of the event During PQT testing supply voltage variations the width of the trigger signal shall change according to the duration of the voltage dip or interrupt 9 3 Synchronization Sync signal Output signal Between pin 7 hi and pin 2 8 15 20 low Inactive state at 24 V in the active state lt 2 4 V The sync signal consists of a level that goes low for each cycle of the mains frequency The reference is the signal at the power supply input EUT supply IN The position timewise of the sync signal corresponds to the specified phase angle converted into time irrespective of the supply frequency 5 The sync signal is only active while an AC test is in prog ress and Fsync is set to sync TASEO Advanced Test Solutions for EMC 88 9 4 Pulse enable next step input Between pin 17 hi and pin 2 8 15 20 low Input open inactive input shorted active If this input is ac
15. as power line dips interrupts and distortions NSG 3040 EMC test system MD 200 Technical specifications MD 200 Attenuation ratio Bandwith Accuracy Max input voltage different mode Max input voltage common mode Input impedance CMRR typical Operating temperature Dimensions LXWXH Connector to scope Input connectors Weight 143 MD 200A 2 ranges 1 100 and 1 1000 DC to 10 MHz 2 7000 V peak 3500 V peak 10 MQ 7 pF each side ground 80 GB at 50 HZ 60 dB at 20 kHz 10 to 40C 14 to 104 F 207 X 83 X 38 mm 8 1 x 0 32 x 0 15 BNC and auxiliary earth lead HV alligator clip 500 g approx 1 1 Ibs Technical specifications MD 200A Attenuation ratio Bandwith Accuracy Max input voltage different mode Max input voltage common mode Input impedance 2 ranges 1 100 and 1 1000 DC to 10 MHz 2 7000 V peak 7000 V peak 10 MQ 7 pF each side ground TASEO Advanced Test Solutions for EMC 144 Input impedance 10 MQ 7 pF each side ground CMRR typical 80 dB at 50 Hz 60 dB at 20 kHz Operating temperature 10 to 40 C 14 to 104 F Dimensions LXWXH 207 X 83 X 38 mm 8 1 x 0 32 x 0 15 Connector to scope BNC and auxiliary earth lead Input connectors HV alligator clip Weight 500 g approx 1 1 Ibs 14 7 2 MD 300 surge pulse current probe set The MD 300 probe has been specially designed to verify surge current pulses as specif
16. communicate with each other on a computer network utilizing the Internet Protocol standard IP Any participating network device must have its own unique address Touch the IP Address button to enter the IP address Enter the IP address using the virtual keypad and confirm with Enter Subnet A subnet is a logical grouping of connected network devices which is used to partition networks into segments Devices on a subnet share a contiguous range of IP address numbers NSG 3040 EMC test system A subnet mask defines the boundaries of an IP subnet and hides the network address portion of an IP address For example if a network has a base IP address of 192 168 0 0 and has a subnet mask of 255 255 255 0 then any data going to an IP address outside of 192 168 0 X will be sent to that network s gateway Touch the SubNet button to enter the subnet mask Enter the subnet mask using the virtual keypad and confirm with Enter Gateway A gateway is a node on a network that serves as an entrance to another network In enterprises the gateway is the computer that routes the traffic from a workstation to the outside network that is serving the Web pages In homes the gateway is the ISP that connects the user to the internet nenterprises the gateway node often acts as a proxy server and a firewall The gateway is also associated with both a router which use headers and forward ing tables to determine where packets are sent
17. connected then the ground strap must be connected from the CDN to the reference ground plane There is no need to connect the ground connector from the generator itself since the burst con nector provides the reference ground from the generator to the CDN Reference ground terminal The NSG 3040 can be efficiently connected to the GRP using the ground strap supplied with the system This ground link must be used for burst tests to obtain reproducible test results NSG 3040 EMC test system 6 1 3 Surge or SOW output NSG 3040 models including CWM 3450 Combination Wave Surge Module These sockets high low connect the surge output signal to an external CDN or to another external coupling unit These sockets are also used to connect the internal generator to the optional magnetic field coil for tests with pulsed magnetic fields The surge output is potential free floating The inner conductor of each con nector is the surge high and surge low connection respectively while the outer conductor screen is connected to the NSG 3040 s ground terminal NSG 3040 SOW For the NSG 3040 SOW models both of these sockets are used to connect the slow damped oscillatory wave signal to an external coupling device The surge output is potential free floating The inner conductor of each con nector is the surge high and surge low connection respectively while the outer conductor screen is connected to the NSG 3040 s ground te
18. does not assume any liability for errors or inaccuracies
19. during installa gt tion and interconnection 1 Connect MFO 6501 to INA 701 702 or 703 loop 2 In case of use of INA 702 insure that power plug is fitted 3 Connect MFO 6501 to mains 4 Connect external amp meter 5 Switch on mains power 6 Adjust the required current through the loop using the knob TASEO Advanced Test Solutions for EMC 128 Sa Operation adjustments The field generated in the loop antenna is directly proportional to the current flowing through it Field strength A m H Cf x Where H is the generated field Cf the coil factor the current flowing through the loop Please refer to following table for test level adjustment Standart level Field in Current re Current required Current re the loop quired for INA for INA 702 quired for INA A m 701 Cf 0 89 power Cf 9 8 703 Cf 34 1 1 1 12 0 102 0 029 2 3 3 37 0 306 0 088 3 10 N A 1 02 0 294 4 30 N A 3 06 0 882 X 40 N A 4 08 1 176 X 120 N A N A 3 53 Use the external amp meter to adjust the required current NSG 3040 EMC test system 14 4 2 Automatic solution MFO 6502 The automatic current generator type MFO 6502 magnetic field option is a standard accessory for the NSG 3040 series It provides a convenient means of generating and regulating the current to flow through one of the magnetic field loops INA 701 INA 702 or INA 703 It is required for magnetic field testing f
20. factor the current flowing through the loop The unit has been designed for use in rugged industrial environments Pro fessional quality connectors ensure user safety additional system protection is provided by a temperature sensor located on the heatsink of the power amplifier MFO 6502 is designed to drive INDUCTIVE LOADS ONLY as magnetic field loops Connecting capacitive loads will destroy the Instrument NSG 3040 EMC test system mechanisms it is strongly recommended to power on For proper operation of the plug and play detection 131 first the MFO 6502 accessory and then the NSG 3040 Powering on the NSG 3040 before the accessories mayresult in a non detection of the accessories Circuit diagram MFO 6502 Mains Power supply input 15V OV 15V Sine wave Signal generator Power amplifier l Red Black O 50 HZ Amplitude 60 Hz control Controller Low High range Plug X1 System cable IN 25 Way Sub D Male Plug X2 System cable OUT 25 Way Sub D Female Connection to NSG master Termination with NSG Interlock controller via system interface cable plug TASEO Advanced Test Solutions for EMC 132 Technical specifications MFO 6502 Parameter Total harmonic distortion THD Frequency Magnetic field adjustment Range low Range high Supply voltage Power consumpt
21. field testing for fields up to 40 A m It complies to the requirements of IEC 61000 4 8 a Se HSS Brn gt TSSEQ MAGNETIC FIELD GENERATOR MFO 6501 ees MFO 6501 can be used as a stand alone It is fitted with carrying handles as part of its overall good ergonomic design which makes for ease of handling Further the unit may be used in any of three operating positions laying or standing on a work bench or for more permanent applications it can be wall mounted tion as the stability is limited so the cabling connecting MFO 6501 to mains and Modula presents a risk of being unvoluntarly caught by the users causing the MFO 6501 to fall down Care has to be taken is case of use in standing posi The few control elements are readily accessible on the front panel A rotary knob to set the necessary current a 50 60 Hz frequency selector and a low high range selector ensure easy and intuitive operation TASEO Advanced Test Solutions for EMC 126 Two safety banana sockets provide a convenient means to connect the loop antenna two other ones shorted by a jumper to connect an external amp meter for monitoring the generated current as the field generated in the loop antenna is directly proportional to the current flowing through it Field strength A m H Cf x Where H is the generated field Cf the coil factor I the current flowing through the loop The unit has been designed for use in rugged industrial en
22. frame is displayed around the field Enter the Stop value using either the wh E Step Touch the Step button eel or the keypad 17 V in the example A red frame is displayed around the field Enter the Step value using either the wh NSG 3040 EMC test system eel or the keypad E Step delay Touch the Step delay button 1 in the example OK A red frame is displayed around the field Enter the Step Delay value using either the wheel or the keypad Touch the Unit button s in the example to set the step delay unit The step delay depends on pulses and the minimum repetition rates Touch the OK button to save all settings and return to the test parameter window EXIT Touch the Exit button to return to the test parameter window without saving settings SHOW STEPS Touch the Show Steps button to view change the order of or delete individual test steps The show step window displays individual test steps in the order that they wi be executed m UP DOWN Use the UP and DOWN arrows on the right side of the Show Step window to change the test step order Touch a line number to select a step A red frame is displayed around the selected step Touch the UP button to move the step up in the list Touch the DOWN button to move the step down in the list DEL Touch a line number to select a step A red frame is displayed around
23. lt 150 kg Rack mounting brackets 4 HU for NSG 3040 series TASEO Advanced Test Solutions for EMC 153 154 O 15 SYSTEM DESCRIPTION Dimensions NSG 3040 449 17 7 x 226 8 9 5 HU x 565 mm 22 2 Weight NSG 3040 Description Housing Mains on off Indicator LED s on front panel Safety functions Ambient conditions Self test Relevant safety standards WxHxD approx 28 kg 62 Ibs Test system for EMC tests with mains borne inter ference in accordance with the EN 61000 6 1 and 2 standards for burst surge and mains quality tests Operation via touch screen or software wise via a PC ink Ethernet TCP IP interface Pulse output to external coupling networks Housing for bench top or rack use Bench top housing made of metal with moulded plastic front panel Supplementary rack mounting kit On off switch on rear panel of the instrument Power on LED yellow Pulse LED green High voltage active LED red EUT Power on LED green Error LED red Main fuses interlock EUT fail input 5 to 40 C 20 to 80 relative humidity non con densing 68 106 kPa atmospheric pressure Routines for functional self test IEC 61010 1 safety requirements for electrical equip ment used for measurement and control purpose as well as laboratory use NSG 3040 EMC test system NOTES Ad TASEO vanced Test Solutions for EMC 155 Headq
24. ma system is performing a test TASEO Advanced Test Solutions for EMC 10 O 2 INTRODUCTION E 2 1 General description The NSG 3040 test system is a multifunction generator that simulates cable borne electromagnetic interference effects for immunity testing to interna tional national and manufacturers standards The system is designed to fulfill conducted electromagnetic compatibility EMC test requirements for compliance testing of household office light industrial or commercial equipment including combination wave surge Electrical Fast Transient EFT pulses and Power Quality Testing PQT The NSG 3040 s modular architecture and industry standard interfaces allow it to be easily expanded and customized to meet individual testing needs The system is designed as a series of interoperable function units with a master controller that handles the real time functions and communicates with the function modules Each function unit contains a slave controller all function units are connected together through their slave controllers and networked with the central master controller via a field bus Interbus Information concern ing special features and their adjustable parameters are stored directly in the function modules This modularity enables the function units to be combined into customized test systems and later reconfigured to address changing testing requirements The function units can be readily modified
25. the selected step Touch the DEL button to delete the step OK Touch the OK button to save all settings and return to the test parameter window EXIT Touch the Exit button to return to the Test parameter window without saving settings TASEO Advanced Test Solutions for EMC 49 50 ADD STEP Multi step tests can be programmed manually in the test parameters window using the Add Step button Touch the Add Step button create a new step with the values currently dis played in the Test parameters window The user can program a maximum of 10 test steps When the first test step is programmed Test Step 1 X is displayed in the upper right corner and the step can no longer be changed from the Test parameters window To change a step the user must first delete it using the Show Step button then use Add Step to re enter the step Refer to sections 8 3 8 9 for detailed information on setting parameters for specific types of tests EXPERT MODE The Expert Mode button can be used only if Expert Mode is set to On in the System General settings window see section 7 3 The unique expert Mode is a fast and effective method to determine critical threshold values of a device under test EUT Touch the Expert Mode button to manually adjust test parameters using the wheel while a test is in progress A selected test can be started During run mode the changeabl
26. the orange lamp of INA 3001 warning lamps 9 7 High voltage active Between pin 16 Hi and pin 2 8 15 20 low This function is activated for firmware revisions 2 30 and higher This output is to drive external warning lamps INA 3001 The HV on signal is working together with the high voltage LED located on the front panel Output high 24 V High voltage is ON Output low 0 V High voltage is OFF TASEO Advanced Test Solutions for EMC 90 10 COUPLING NETWORK CDN 3041 E The internal coupling network CDN 3041 is fully integrated in the NSG 3040 generator It enables to couple the different pulses on a single phase EUT within the limits described below Parameter Instrument supply Decoupling attenuation Standard conform pulse Mains decoupling Connections EUT supply EUT VAC EUT VDC EUT current EFT burst NSG 3040 EMC test system Value 85 265 VAC Remanent pulse 15 max Mains side crosstalk 15 max 1 2 50 us up to 4 4 kV 8 20 US up to 2 2 kA 1 5 MH Pulse input s from generator Cable connector for EUT supply input and output Power inlet for CDN 1 phase P N PE 24 to 270 V rms 50 60 Hz Phase Neutral 400 Hz max 0 to 270 VDC 1x16 Arms continuous over heat protected 1x 25 Arms for 30 min Standard coupling all lines to HF reference ground GND IEC EN 61000 4 4 and ANSI IEEE C62 41 L N PE GND Combination wave pulse PQT Any lines and combination to re
27. window in figure below displayed Touch the individual High and Low output coupling buttons L N and PE in the example to select an open or closed relay Touch OK to enable the coupling selection and close the window Touch Cancel to close the window without saving the coupling selection Touch Show Graphics to display a graphical example of the coupling selection NSG 3040 EMC test system IEC coupling selection window 8 4 7 Repetition time Touch the Repetition time button 60 s in the example to set the test repeti tion time A red frame is displayed around the field The repetition time may be entered using the wheel or the keypad Touch the units button s in the example to set the time unit Time units are s and min 8 4 8 Test duration Touch the Test duration button 10 in the example to set the test duration time A red frame is displayed around the field The duration time may be entered using the wheel or the keypad Touch the units button pulse in the example to set the unit Unit values are pulse and cont continuous 8 4 9 Surge generator technical data Parameter Value Pulse voltage open circuit 200 V to 4 4 kV in 1 V steps Pulse current Short circuit 100 A to 2 2 KA Impedance 22 Polarity Positive negative alternate Phase synchronization Asynchronous synchronous 0 to 359 in 1 steps TASEO Advanced Test Sol
28. 0 5 Cycle dips up to nes Class 2 Short interruption 0 250 Cycle dips nes Class 3 Short interruption 0 250 Cycle dips nes Class 2 Short interruption 0 300 Cycle dips nes Class 3 Short interruption 0 300 Cycle dips ations ations Dips and Interrupts for DC lines IEC 61000 4 29 DC voltage variati DC voltage variati DC voltage variati DC Voltage Dips 40 0 01 s up to 1 DC Voltage Dips 70 0 01 s up to 1 s DC voltage interruption 0 0 001 s up to 1s on 80 0 1 s up to 10 s on 85 0 1 s up to 10s on 120 0 1 Sup to 10S Slow Damped Oscillatory Wave SOW IEC EN 61000 4 18 1 Phase power lines L N coupling 100 kHz level 1 up to level 3 1 Phase power lines L N coupling 1 MHz level 1 up to level 3 1 Phase power lines L PE coupling 100 kHz level 1 up to level 3_noteA 1 Phase power lines L PE coupling 1 MHz level 1 up to level 3_noteA 1 Phase power lines LN PE coupling 100 kHz level 1 up to level 3_noteA 1 Phase power lines LN PE coupling 1 MHz level 1 up to level 3_noteA 1 Phase power lines N PE coupling 100 KHz level 1 up to level 3_noteA 1 Phase power lines N PE coupling 1 MHz level 1 up to level 3_noteA NSG 3040 EMC test system ANSI IEEE C37 90 1 SOW 1 Phase power 1 Phase power 1 Phase power 1 Phase power l 1 Phase power 1 Phase power 1 Phase power 1 Phase power IEC 61850 3 S 1 Phase power 1 Phase power 1 Phase power 1 Phase power IEC 60255
29. 118 can be easily interfaced with the EUT and is designed as a bench top unit It can be used with Teseq s NSG Series or any industry standard surge generator with the appropriate connector adapter NSG 3040 EMC test system Technical specifications Parameter Max operating voltage Max operating current Ohmic resistamce per path Decoupling chokes 1 KHz Pulse Max pulse voltage Accessories Resistor networks Coupling adapters 141 itn Z5 Value AC 250 V DC 250 V O0 5A eye 20 mH nominal 1 2 50 and 10 700 us pulse 6 6 kV line to ground 3 kV line to line INA 172 4x 100 0 6 W INA 175 4x 160 0 6 W INA 170 Sparkling gap device 90 V trip voltage INA 171 Capacity 0 1 UF spark gap device 90 V trip voltage INA 173 Short circuit connector TASEO Advanced Test Solutions for EMC 142 14 7 Measuring accessories 14 7 1 MD 200 and MD 200A differential high voltage probes The Teseq MD 200 and MD 200A high voltage differential probes are ideally suited to allow EMC engineers to verify their conducted EMC test generators periodically Their performance permits to be used for many other purposes where higher voltages have to be measured in a potential free manner Annual calibration and periodic verification The annual calibration of test equipment recommended by most of the quality systems ISO 9000 ISO 17025 etc has to be considered as a validation of all measurements done since the l
30. 26 1 Phase power 1 Phase power 1 Phase power 1 Phase power IEC 62052 11 1 Phase power 1 Phase power 1 Phase power EC TS 61000 6 55 ines L N coupling 1 MHz 2500 V ines L PE coupling 1 MHZ 2500 V ines LN PE coupling 1 MHz 2500 V ines N PE coupling 1 MHZ 2500 V 5 SOW ines L N coupling 1 MHz 500 1000 2500 V ines L PE coupling 1 MHz 500 1000 2500 V ines LN PE coupling 1 MHz 500 1000 2500 V ines N PE coupling 1 MHz 500 1000 2500 V OW ines L N coupling 1 MHz 2500 V ines L PE coupling 1 MHZ 2500 V ines LN PE coupling 1 MHz 2500 V ines N PE coupling 1 MHZ 2500 V formerly IEC 60255 22 1 SOW nes LN coupling 1 MHz 1000 2500 V nes L PE coupling 1 MHz 1000 2500 V nes LN PE coupling 1 MHz 1000 2500 V ines N PE coupling 1 MHz 1000 2500 V SOW ines L N coupling 100 kHz 1 MHz 1000 V nes L PE coupling 100 kHz 1 MHZ 2500 V nes LN PE coupling 100 kHz 1 MHZ 2500 V 1 Phase power ines N PE coupling 100 KHZ 1 MHz 2500 V TASEO Advanced Test Solutions for EMC 56 8 2 3 SAVE TEST The Save Test button is used to save the current test to a file for later use Touch the Save Test button A keyboard is displayed Touch the individual keys to enter a file name in the black bar above the keyboard The Delete key will delete all text entered The backspace button lt will delete the last letter entered Touch the Enter button to save the file
31. 3061 series HV plug set Surge out for NSG 3000 series for cable diameter 10 3 mm Can be used for connection to external CDN or to make an injection probe to couple surge pulses to shielded datalines and EUT s housings TASEO Advanced Test Solutions for EMC 151 152 f INA 6545 L INA 6546 O INA 6547 O INA 6548 Q INA 6556 NSG 3040 EMC test system HV plug set surge out for NSG 3000 series for cable diameter 5 1 mm Can be used for connection to external CDN or to make an injection probe to couple surge pulses to shielded datalines and EUT s housings SHV plug burst out for all Schaffner Teseq Burst generators Burst CDNs and coupling clamps For cable diameter 5 1 mm typical RG 58 or INA 6547 or INA 6548 20 kV coax cable length 1m To be used together with INA 6545 for connection to external CDN or to make an injec tion probe to couple surge pulses to shielded datalines and EUT s housings 20 kV coax cable length 5 m To be used together with INA 6545 for connection to external CDN or to make an injec tion probe to couple surge pulses to shielded datalines and EUT s housings DC supply adapter Consists of EUT Power IN cable fitted with safety banana plugs at the other end For NSG 3000 series 14 9 Mounting accessories INA 3000 INA 166 Trolley for NSG 3000 series Convenient accessory to get standalone instru ments stacked and mobile through large castors Static load
32. 40 EMC test system Plug X1 NSG 3040 system interface IN to be connected to NSG 3040 or to 119 another accessory to X2 plug Power LED green shows if instrument is powered up Error LED red ERROR LED off No problem accessory is ready to run ERROR LED blinking Problem which may be solved by user intervention Ex Interlock is activated emergency button is pressed overtemperature for MFO 6502 ERROR LED on Problem which needs module repair please contact your nearest Teseq customer support center or sales representative Installation connection to NSG 3040 The equipment should be switched off during installa gt tion and interconnection 1 Verify the setting of input voltage selector and adjust it to the right mains voltage value if required 2 Connect instrument power from the mains 3 Remove 25 way Sub D plug at rear of NSG 3040 4 Connect this connector to X2 of INA 6502 5 Connect master controller 25 way output to INA 6502 X1 plug using system interface cable delivered with INA 6502 6 Connect INA 6502 EUT power out to NSG 3040 EUT power input 7 Connect INA 6502 EUT power in to mains using EUT power in cable delivered with NSG 3040 Because of the capacitors in the internal coupler of NSG 3040 earth leakage currents of up to 4 A can occur in the EUT power supply network The test system must therefore be correctly earthed and be powered from a supply that is not protected by a residu
33. 5 Warranty Teseq grants a warranty of 2 years on this test system effective from the date of purchase During this period any defective components part will be repaired or replaced free of charge or if necessary the test system will be replaced by another of equivalent value The decision regarding the method of reinstating the func tiona capability is at the sole discression of Teseq Excluded from the warranty is damage or consequential damage caused through negligent operation or use as well as the replacement of parts subject to degradation The warranty is rendered invalid by any intervention on the part of the customer or a third party The faulty items have to be returned in their original packagin ga Teseq accept no responsibility for damage in transit TASEO Advanced Test Solutions for EMC 101 102 13 DECLARATION OF CONFORMITY CE THSEO Advanced Test Solutions for EMC Teseq AG Nordstrasse 11F 4542 Luterbach Switzerland T 41 32 681 40 40 F 41 32 681 40 48 www teseq com Declaration of conformity Manufacturer Teseq AG Address Nordstrasse 11F 4542 Luterbach Switzerland declares that the following product Product NSG 3040 Options Variants all conforms to the following Directives and Regulations EMC Directive 2004 108 EEC LVD Directive 2006 95 EEC Generic standards EN 61326 1 2013 EN 61326 2 1 2013 EN 61010 1 2010 The purpose of this instrument is the
34. C EN 61000 4 5 for unshielded unsymmetrical line pairs can be performed both in differential and common mode coupling line to line and line to ground The user can manually select coupling modes by connecting the surge generator s output to the appropriate input of the CDN 117 Several CDN 117s can be arranged in parallel for applications in which more than two conductors must be decoupled The CDN 117 can be easily interfaced with the EUT and is designed as a bench top unit It can be used with Teseq s NSG Series or any industry standard surge generator with the appropriate connector adapter TASEO Advanced Test Solutions for EMC 139 140 Technical specifications Signal line Max operating voltage AC 250 V DC 250 V Max operating current ISIA Ohmic resistamce per path 250 Decoupling chokes 1 KHz 20 MH nominal Pulse 1 2 50 us pulse Max pulse voltage 6 6 kV Accessories Series resistor 2x 400 6W Coupling adapters INA 170 Sparkling gap device 90 V trip voltage INA 171 Capacity 0 1 UF spark gap device 90 V trip voltage INA 174 Capacitor 0 5 UF 14 6 3 Surge pulse CDN for symmetric datalines CDN 118 Teseq s CDN 118 coupling decoupling network is designed for convenient surge testing of telecommunications equipment to IEC EN 61000 4 5 which specifies a 1 2 50 or a 10 700 us pulse The CDN 118 includes the special decoupling network and coupling elements that are required for these tests The CDN
35. Generator WARNING Users must be aware of the following dangers that can occur during testing E Local burning arcing ignition of explosive gases E EUT supply current surge caused by a flashover or breakdown resulting from the superimposed high voltage E Disturbance of other unrelated electronics tele communications navigational systems and hear pacemakers through unnoticed radiation of high frequency energy E In the test system the interference voltage corre sponding to the level called for in the relevant test specification is superimposed also on the EUT s protective earth conductor Earth contacts or pins e g as in German and French mains plugs as well as the EUT earth itself can therefore be at an elevated voltage level that would make touching dangerous In many power connectors even the screws are linked to the protective earth Warning symbols on the test system A A CAUTION Warning of a danger spot refer to the documentation Caution Warning of electrial hazards NSG 3040 EMC test system 4 7 Dangers concerning the EUT WARNING Users must be aware of the following dangers that can occur during testing E EUTs are often functional samples that have not yet been subjected to safety tests It is therefore possible that the EUT could be damaged by internal overloads or may even start to burn E As soon as the EUT shows signs of being disrupted the test should be stopped and the power to
36. NSG 3040 SOW is a single function generator made for Slow Damped Oscil latory wave immunity testing according to IEC EN 61000 4 18 100 KHz amp 1 MHz pulses as well as to ANSI IEEE C37 90 1 1 MHz pulse The generator comes with an integrated single phase 270 VAC 16 A CDN NSG 3040 EMC test system 12 MAINTENANCE AND FUNCTION 99 CHECK Ml 12 1 General Inside the test system there are no adjustable elements accessible to the user neither for calibration nor for maintenance purpose The housing of the test system must not be opened except for SW update via SD card Should any maintenance or adjustment become necessary the whole test system together with an order or fault report should be sent to a Teseq service center Maintenance by the user is restricted to cleaning the outer housing performing a function check and verification of the pulse parameters The only exception concerns the exchange of modules or the upgrading of the system with new modules In such cases the instructions accompanying the modules are to be strictly observed 12 2 Cleaning In general a moist cloth is sufficient for cleaning the outer housing including the touch panel If necessary add a small amount of a mild non foaming household cleanser No chemicals acid etc should be used for cleaning purposes Before beginning to clean the test system ensure that it is switched off and the mains power cable is unplugg
37. O system 0 001 V Amp Q system 8mm SMA with SMA and BNC connectors OOS See 500 lt 2 Carry case Current probe coax cable with SMA BNC connector shorting cable with safety banana connectors calibration certificate user manual FISCHER to banana plug adaptor set LEMO to banana plug adaptor set IEC 320 single phase to safety banana adaptor leads 2 x 155 131 6 to 4 mm adaptors with safety banana connectors Note The carry case provides spare place for all options TASEO Advanced Test Solutions for EMC 146 14 7 3 MD 310 SOW pulse current probe set The MD 310 probe is specially adapted to verify Damped Oscillatory Wave current pulses as specified in IEC EN 61000 4 18 or ANSI IEEE C37 90 1 and their derivates The main advantage of the MD 310 current probe is that the measuring system is physically isolated from the circuit under test The MD 310 current probe is ready to use It comes with a pre mounted coaxial cable as well as the conductor carrying the SOW current to be measured The BNC end plug needs to be connected to the high impedance input or 50 Q input of an ordinary memory oscilloscope Then the conductor carrying the SOW current to be measured needs to be connected between the EUT supply The resulting voltage wave shape on the oscilloscope will then be an authentically reproduction of the actual current wave shape within the given accuracy Optional FISCHER connectors are available for matching t
38. Parameter Value Field strength 1 to 100 A m in 1 A m steps Frequency 50 Hz 60 Hz Coil factor 0 01 to 99 99 Test duration S 1 9 999 min Ia WES Continuous More information about variable voltage sources is available in section 14 Accessories TASEO Advanced Test Solutions for EMC 78 8 7 Pulsed Magnetic Field testing 4 9 parameter setting Pulsed Magnetic Field test Field Strenght 4 Pos 1000 Afm Yous to aso Impedance 20 Repetition 60 s Test Phase a amc Duration 10 Put Os a l Pulsed Magnetic Field test window e Parameter Value Field 1 to 9999 A m in 1 A m steps Polarity positive negative alternate V to A m ratio Coil factor 0 35 to 99 99 Impedance 2O Repetition time Si 10 600 mane l 1 Test duration 1 to 9 999 pulses Continuous Phase synchronization asynchronous synchronous 0 to 359 in 1 steps More information about variable voltage sources is available in section 14 Accessories 8 8 Slow Damped Oscillatory Wave test 4 18 parameter setting The slow damped oscillatory wave immunity test simulates switching of dis connectors in HV MV open air substations and is particularly related to the switching of HV busbars as well as to the background disturbance in industrial plants as specified in IEC EN 61000 4 18 and ANSI C37 90 1 The NSG 3040 SOW is not only able to perform the slow damped oscillatory wave immunity test according
39. al current detec tor RCD TASEO Advanced Test Solutions for EMC 120 Fa il o 1 Switch on INA 6502 first 2 Switch on the NSG 3040 3 Switch on EUT power red switch when power for the EUT is required HW Detection The INA 6502 is automatically detected by the NSG 3040 during the booting process Its presence is visualised in the system settings screen Equipment details CWM 3450 0002 11 22 2 2009 13 2 2009 FTM 3425 0002 11 73 19 11 2010 19 11 2010 INA 6502 0002 10 4267 23 11 2009 14 2 2011 Operation The parameter Field Voltage Uvar gets active once an INA 6502 has been detected by the software The entry of Uin is by default 230 V and may be set to other voltages this can be done in the system general windows Uvar can be selected for one of the 4 available variable voltage levels 0 40 70 80 Dips and Drops test Voltage zl O O jfa Uvar a 70 Phase ai 0 Synch T Event a 10 as Repetition Step ta Time 1 Duration 3 pute ADD STEP NSG 3040 EMC test system 14 4 Magnetic field options Magnetic fields at mains frequency Mains frequency magnetic fields simu around current carrying power supply NSG 3040 together with MFO 6501 or a current into a magnetic field loop The generator together with an audio curren tion is that both 50 and 60 Hz fields can Pulsed magnetic fields Tests with pulsed magnetic fields sim pulses such as those occurri
40. ansformer Peak inrush current capability Switching times Phase phase synchronization Time rep repetition time Event time T Event Test duration Value From EUT voltage input to 0 V 0 up to 265 V up to 115 of Uin 16 A max 10 0 40 70 80 gt 500 A at 230 V 1 to 5 us 100 Q load Asynchronous synchronous 0 to 359 in 1 steps Us 40 99 999 ms 1 99 999 Si 1 cs SEO min 1 sn BS cycle 1 99 999 Us 20 99 999 ms 1 99 999 Si 1 11999 cycle on SOW 110 cycle xs SOG Si 1 99 999 min 1 70 000 pulse 1 99 999 Continuous 8 5 9 Variation test technical data Parameter Uvar with optional variac Phase synchronization Repetition time Value up to 265 V in 1 V steps up to 115 of Uin in 1 steps asynchronous synchronous 0 to 359 in 1 steps 1000 ms to 35 min 1 to 99 999 cycles TASEO Advanced Test Solutions for EMC 76 Decreasing time Td ms 1 5000 S Tes cycle 1 250 cycles for 50 Hz 1 300 cycles for 60 Hz Abrupt Time at reduced voltage Ts ms 1 10000 S cca 10 CYCIER ie Z50ICVCleS Toh 5OiRIZ 1 300 cycles for 60 Hz Increasing time Ti il Sane OOO S IES cycle 1 250 cycles for 50 Hz 1 300 cycles for 60 Hz Test duration S I an SY VOD min 1 70 000 pulse 1 99 999 Continuous Automatic accessories for power quality test All automated standard accessories for PQT test
41. ast calibration any EMC standards call for a verification of the test equipment before and fter every test session If the verification shows differing results no valid test results can be assumed and the test equipment has to be re calibrated It is therefore highly recommended that the EMC test engineer periodically verifies his test equipment in order to ensure good functionality and accuracy fab Periodic verification can be done before a test session or once a day or week or month it is up to the user to decide Only a few points need to be checked which will take only a few minutes if the right test equipment is available Potential free differential measurements Since it may be useful to measure pulses Superimposed on the mains for peri odic verification purposes it is essential to work with differential measurements Using classic non differential probes and connecting with reversed polarity will result in the oscilloscope chassis being connected to the mains In the best case a circuit breaker will trip in the worst case for example if the oscilloscope is battery powered or supplied via an isolation transformer the oscilloscope chassis will be at a voltage equal to mains voltage plus the peak pulse voltage which could be lethal for the user The Teseq high voltage differential probe MD 200 series is ideally suited to measure all kinds of EMI pulses in the microsecond range industrial telecom and automotive surges as well
42. be connected for PQT tests occur on these power lines Such voltages can under certain circumstances destroy power supplies It is the user s responsibility to provide adequate protection at the source input re WARNING Pulse overshoot spikes of up to 630 V can currents of up to 4 A the EUT power supply network The test system must therefore be properly grounded and powered from a supply that is not protected by a residual current detector RCD m Capacitors in the coupler can cause ground leakage The power source to this connector provides the power for the EUT Burst and surge interference signals are coupled into this supply line internally Power is also delivered via this route for PQT mains quality testing purposes NSG 3040 EMC test system 6 2 3 DC EUT input For DC voltages La positive N negative In DC applications the positive and negative lines are to be connected to La and N respectively The polarity at this EUT power input connector will be the same at the EUT output connector 31 The connector s ground contact must be connected to a good solid ground point 6 2 4 Ground connection point This ground terminal provides a solid connection point to the NSG 3040 s chassis ground 6 2 5 System interface connector 25 pin D sub Pin Sync line Signal Remark Working direction f Mains voltage passes 74 S
43. ch panel Rotary encoder Large Start Stop and Pause buttons 5 status LEDs Universal power supply 85 265 V 50 60 Hz System master controller Single phase coupling network CDN 3041 270 V 16 A Fan with thermoregulated cooling controls LAN ETHERNET Interface User manual S FTP interface cable Mains supply cable and EUT supply cable Grounding strip 11 2 2 Mainframe for exclusive remote control NSG 3040 MF ERC ERC stands for exclusive remote control The NSG 3040 MF ERC is similar to NSG 3040 MF but comes without user interface It includes following parts 19 EMC Housing with front rear panels internal mechanics wirings and plugs 5 status LEDs Universal power supply 85 265 V 50 60 Hz System master controller Single phase coupling network 270 V 16 A Fan with thermoregulated cooling controls LAN ETHERNET Interface User manual S FTP interface cable Mains supply cable and EUT supply cable Grounding strip TASEO Advanced Test Solutions for EMC 94 11 2 3 Combined wave surge module CWM 3450 The CWM 3450 is a 4 4 kV Combined wave surge module and is compliant to EN IEC 61000 4 5 It comes fully programmed and tested A traceable calibra tion certificate is part of the delivery 11 2 4 Dips and interrupts module PQM 3403 The PQM 3403 is a single phase 16 A dips and interrupts module and is compli ant to EN IEC 61000 4 11 and 29 It comes fully programm
44. connecting INA 6501 to mains and Modula presents a risk of being unvoluntarly caught by the users which could cause the INA 6501 to fall down The few control elements are readily accessible on the front panel An EUT power on off switch with a power on indicator and a well proportioned rotary switch to select the required voltage ensure easy and intuitive operation The unit has been designed for use in rugged industrial environments Professional quality connectors ensure user safety additional system protection is provided by a 16 A fuse located in the front panel Thanks to the provision of an 80 voltage position and to the large overcurrent capabilities the step transformer is fully compliant with the latest requirements called for in IEC 61000 4 11 2004 standard INA 6501 Step transformer S1 F1 i 1 i 1black i i black 3 g brown 3 Lvar 0 blue 2 N S1 N 2 blue Ye Gr Ye Gr TASEO Advanced Test Solutions for EMC 114 Technical specifications INA 6501 Input voltage Output voltage Accuracy Voltage change with load 100 output O to 16 A 80 output 0 to 20A 70 output 0 to 23 A 40 output O to 40 A Output current capability at 230 V input voltage Voltage selection EUT power on off function Fuse Connectors Power Supply Size Weight Output cable length Input cable 0 to 250 VAC not suited for DC voltages 4 steps 0 40 70 80 5 less than 5 les
45. ct synchronisation of the PQT events TASEO Advanced Test Solutions for EMC 107 108 Thanks to internal advanced microprocessor based control electronics the VAR 3005 features permanent self regulation self check mains voltage check phase rotation check and informs the user or stops the test if the surrounding condi tions are not given to guarantee a proper testing For further details please refer to the VAR 3005 User manual Available models VAR 3005 D16 Dual up to 265 VAC 16 A source VAR 3005 S16 Single up to 265 VAC 16 A source NSG 3040 EMC test system Installation connection to NSG 3040 109 MAINS should be switched off during installation and interconnection 1 Disconnect instrument power from the mains 2 Remove the 25 way Sub D plug on the rear of the NSG 3040 3 Connect the 25 way Sub D cable to the X2 plug of the VAR 3005 4 Connect the master controller 25 way output to the VAR 3005 X1 plug using the system interface cable provided with the VAR 3005 5 Connect the VAR 3005 EUT power out to the NSG 3040 EUT power input 6 Connect the VAR 3005 EUT power in to mains using the EUT power in cable delivered with NSG 3040 3040 earth leakage currents of up to 4 A can occur in the EUT power supply network The test system must therefore be correctly earthed and be powered from a supply that is not protected by a residual current detec
46. d variations Examples of dips amp interrupts Dips amp interrupts generator Voltage U Var Phase Repetition time T Event Test duration Dips and interrupts technical data Variation test technical data Power magnetic field testing 4 8 parameter setting Pulsed magnetic field testing 4 9 parameter setting Slow Damped Oscillatory Wave test 4 18 parameter setting Slow Damped Oscillatory Wave parameters window Coupling Output impedance Timing parameters Test duration Phase synchronization Derating Description of the 25 pin D Sub signals Interlock Trigger to scope output signal Synchronization Sync signal Output signal Pulse enable next step input 62 62 67 67 67 69 69 69 70 71 71 71 72 73 73 74 74 74 74 74 79 75 77 78 79 81 82 82 83 83 83 86 86 87 87 88 TASEO Advanced Test Solutions for EMC 9 5 9 6 9 7 10 11 11 1 11 2 11 2 1 11 2 2 11 2 3 11 2 4 11 2 5 11 3 11 4 11 5 11 6 12 12 1 12 2 12 3 12 4 12 5 13 14 14 1 14 2 14 2 1 14 2 2 14 3 14 3 1 14 3 2 14 3 3 14 4 14 4 1 14 4 2 14 5 EUT fail input EUT power off High voltage active Coupling network CDN 3041 Various NSG 3040 versions NSG 3040 IEC NSG 3040 a la carte customer specific ainframe NSG 3040 MF ainframe for exclusive remote control NSG 3040 MF ERC Combined wave surge module CWM 3450 Dips and interrupts module PQM 3403 Electrical fast transient burst
47. damped oscillatory wave phenomena are divided into two parts The first part is referred to as the slow damped oscillatory wave SOW and includes oscillation frequencies of 100 KHz and 1 MHz The second part is referred to as the fast damped oscillatory wave FOW and it includes oscillation frequencies 3 MHz 10 MHz and 30 MHz The slow damped oscillatory wave immunity test simulates switching of dis connectors in HV MV open air substations and is particularly related to the NSG 3040 EMC test system switching of HV busbars as well as to the background disturbance in industrial plants as specified in IEC EN 61000 4 18 and ANSI C37 90 1 The NSG 3040 SOW is not only able to perform the slow damped oscillatory wave immunity test according to both of these standards but includes a wide range of over testing capabilities like higher pulse voltage higher pulse repetition rates and a selectable source impedance for tests closer to reality conditions TASEO Advanced Test Solutions for EMC 16 4 SAFETY INSTRUCTIONS E The NSG 3040 system and its accessories operate at high voltages i WARNING Improper or careless operation can be fatal These operating instructions form an essential part of the equipment and must be available to the operator at all times The user must obey all safety instruc tions and warnings Neither Teseq AG Luterbach Switzerland nor any of its subsidiary sales orga nizations can accept any liability for p
48. ds with the voltage of the local supply to which the instrument will be connected and that the fuses are correctly rated 2 x 3 15 AT i WARNING Before operating the NSG 3040 make sure NSG 3040 EMC test system 6 2 2 EUT power input This input is the connection point for the power source which supplies power to the EUT The 4 pin connector is a special 16 A type A mating plug with 2 m of cable for supplying the EUT from a normal mains outlet is included with the system The connector is comprised of the pole contact La No 1 the variable voltage pole contact Lb No 3 the neutral return contact N No 2 and the ground connection to the EUT The zero cross reference for synchronization purpose is taken all the time from La to N EUT mains input E 1 La Phase black E 2 N Neutral blue E 3 Lb Variable voltage pole red or brown E 4 GND Earth green yellow Wire colors and functions Black Phase conductor La Pin 1 Blue Neutral return N Pin 2 Red or brown Variable voltage pole Lb Pin 3 Green yellow Ground conductor PE Pin 4 TASEO Advanced Test Solutions for EMC 29 30 30 25 20 E Wire 2 5 mm2 E Wire 1 5 mm2 Operating current a E Wire 1 0 mm2 20 40 60 80 100 120 C Ambient temperature The additional variable voltage pole contact Lb No 3 enables a variac or alter native source to
49. e parameter can be touched the value window is highlighted with a red frame like the voltage frame shown in the examples above The value can now be changed via wheel and by pressing again the START button the value will be accepted and on the pulse output the new value is displayed NSG 3040 EMC test system E Expert Mode in Burst EFT Mode For safety reasons the Expert Mode activation needs to be confirmed again when using Burst Mode in the Burst Parameters Screen 51 Following parameters can be controlled using Expert Mode E Volt please note the voltage change is only possible if the polarity is set to Negative or Positive E Frequency E Phase E Burst time Burst Electrical Fast Transient test Volt Alt 200 V 1 Frequency a 5 ke Phase Asynch Ea Sn o Burst ne 75 sre Ermon 300 m Test Duration 120 J ao STEP E Expert Mode in SOW Mode In SOW Mode only the voltage can be changed during a running test using Expert Mode TASEO Advanced Test Solutions for EMC 52 8 2 The bottom bar 8 2 1 LOAD USER TEST Touch the Load User Test button to display a list of all test files that have been created and saved by the user Only files for the selected test type are displayed The Figure below shows the load user test window with several burst tests displayed The user can scroll through the tests by touching the UP and DOWN arrows
50. ed and tested A traceable calibration certificate is part of the delivery 11 2 5 Electrical fast transient burst module FTM 3425 The FTM 3425 is a 4 8 kV fast transients burst pulse module and is compliant to EN IEC 61000 4 4 It comes fully programmed and tested A traceable calibra tion certificate is part of the delivery 11 3 NSG 3040 xxx ERC series ERC stands for Exclusive Remote Control Several models of the NSG 3040 series can be delivered in ERC configuration These special versions are made for the users who want to drive the instruments exclusively with a PC using WIN 3000 software In this case they might not need or even not want any User interface SUI on the instrument front panel NSG 3040 EMC test system Care has to be taken at first installation as WIN 3000 needs proper installation 95 on the drive PC The setting of the interfaces needs to be done properly For this consult the documents in PDF format available on the CD delivered with the instrument 601 326B NSG unit amp WIN 3000 Installation Quick installation guide english pdf Refer to sections 1 2 3 4 and 5 of this document The factory setting of NSG 3040_ERC series is IP address 10 10 10 10 SubNet 255 0 0 0 Port 1025 is IP address 10 10 10 10 SubNet 255 0 0 0 Port 1025 Care has to be taken to remember the new settings if these get changed m WARNING The factory setting of NSG 3040_ERC series Forgotten IP settings ca
51. ed from the supply TASEO Advanced Test Solutions for EMC 100 12 3 Function check The safety measures described previously must be strictly observed while carrying out a function check As soon as the test system is switched on the Power LED should light up If this is not the case then please check the mains power connection to the test system as well as the fuses voltage selector and any other cabling The instrument automatically carries out a diagnostic routine once it has been successfully switched on The generator cannot perform any test while the interlock circuit is open Pulse generation can be observed at the output connectors by means of an oscilloscope This is a practical way to check that the system is functioning correctly but should never be used for reference or calibration purposes Do not connect the oscilloscope directly in order not to gt exceed its max input voltage Teseq recommends the use of a HV differential probe type MD 200 or MD 200A along with the INA 6560 safety banana adapter as well as CAS 3025 and MD 300 or MD 310 See paragraph accessories 12 4 Calibration The combination of high voltages and high frequencies in a single pulse makes the calibration of EMC pulse generators particularly demanding and difficult Teseq has one of the few accredited test laboratories in Europe that is in the position to undertake calibrations in this specialized field NSG 3040 EMC test system 12
52. ed off during installa tion and interconnection Installation connection to NSG 3040 1 Connect instrument power in to mains 2 Remove 25 way Sub D plug at rear of NSG 3040 3 Connect this connector to X2 of MFO 6502 4 Connect NSG 3040 25 way output to MFO 6502 X1 plug using system interface cable delivered with MFO 6502 5 Connect MFO 6502 to loop antenna INA 701 702 or 703 6 In case of INA 702 verify that Power plug is fitted to the coil interface unit 7 Power on MFO 6502 8 Power on NSG 3040 main frame Operation The coil factor is given by the loop antenna manufacturer For Teseq INA 701 702 and INA 703 loop antennas this factor is labelled on the antenna and is also indicated in the test report delivered with it TASEO Advanced Test Solutions for EMC 134 Power Line Magnetic Field test Field Coil Strenght ai 1 A m Factor 0 89 i Frequency 50 Hz fee 10 s Re o Be 14 5 Pulse wave shape adapter INA 752 The pulse waveshape adapter INA 752 is a standard accessory for the Teseq NSG 3000 series t provides a convenient means for interconnecting the NSG 3040 surge generator with the loop antennas INA 701 or 702 and insures that the generated pulsed magnetic field has the waveshape as specified in the application standard The combination NSG 3040 with CWM 3450 INA 752 INA 701 or 702 is required for magnetic field testing for pulsed fields up to 1200 A m It c
53. el A wheel for setting parameters A wheel sensitivity keys labeled 1 10 and 100 to denote the units A Start key to start tests A Stop key to stop tests A Pause key to pause tests E Start key E Pause key E Stop key NSG 3040 touch touch screen keys and wheel CAUTION Never use a metal sharp or pointed tool for 1 touching the panel Use a soft towel for cleaning Never use aggressive cleaning liquids As soon as the unit is powered and switched on the boot procedure starts approx 30 s and the Start menu is displayed NSG 3040 EMC test system THSEO Advanced Test Solutions for EMC ESD simulators compact user friendly and ready for tomorrow s standards m Mr anel contact corps operon 200V io 308V Touch screen display amp battery Comer wiih ust standarde IEC ANSI SAE ISO oie Interchangeable and moulded network m m Adjustable decharoadetocton ISO self test functi Loading system parameters please wait SUI boot up screen 7 1 Main menu _TASEO ced Test Solutions for EMC THSEO Advances Test Solutions for EMC film omc NG ane Ne see oA it tes Fee Months Main menu NSG 3040 IEC Main menu NSG 3040 SOW The main menu is displayed following boot up The main menu shows the pos sible pulses or tests which are available to the user depending on the NSG 3040 s configuratio
54. er FW and SUI software are on the WIN 3000 installation disk or can be downloaded from the Teseq website WIN 3000 features a free 30 days licence of the professional version WIN 3000 SRD TASEO Advanced Test Solutions for EMC 103 104 WIN 3000 SDR The extension SDR stands for Sequences Dialogs Reports WIN 3000 SDR is the professional version of PC Software for NSG 3xxx series It features the basic settings possibilities of WIN 3000 inclusive parameter ramping stepping etc and includes additionally E Test library covering most of basic and generic standards E Test sequencer E Real time report facility in MS Word E Dialogs facility with the user WIN 3000 and NSG 3000 series can run via a LAN connection A Win 3000 software licence is always valid for a specific NSG 3xxx instrument Nevertheless the Software can be installed on a unlimited number of computers since the dongle is the NSG 3xxx instrument itself 14 2 Coupling decoupling networks for multiple phases higher currents and voltages To allow testing of equipment rated for multiple phases a wide range of Coupling decoupling networks CDNs is available in various configurations The CDN 3043 and 3063 series are available in multiple configurations and for different EUT currents and voltages These CDN series are fully automatic controlled featuring plug and play technol ogy just connect them to the NSG 3040 and th
55. ersonal material or consequential injury loss or damage that may result from improper use of equipment and acces sories 4 1 General The NSG 3040 must be operated only by authorized and trained specialists The generator is to be used only for the purpose specified by the manufacturer The user is directly responsible for ensuring that the test setup does not cause excessive radiated interference which could affect other instrumentation The test system itself does not produce any excessive EM radiation However the injection of interference pulses into a EUT can result in it and or its associated cables radiating electromagnetic radiation To avoid unwanted radiation the standards organizations recommend that the test setup be operated inside a Faraday cage NSG 3040 EMC test system WARNING NSG 3040 is not suitable for use in an explo sive atmosphere WARNING Personnel fitted with a heart pacemaker must neither operate the instrument nor approach the test setup while a test is being executed Only approved accessories connectors adapters etc are to be used to ensure safe operation WARNING Connect the EUT only after the initial system mA self test has finished 4 2 Installation The NSG 3040 test system conforms to protection class 1 Local installation regulations must be respected to ensure the safe flow of leakage currents WARNING Operation without a ground connection is p forbidden Two independen
56. ey will autodetect and auto configure at system power up available coupling possibilities will show up in respective test windows All CDN 3043 and 3063 series feature Manual and programmable control of EUT power ON OFF E Input phase rotation detection NSG 3040 EMC test system Thermal monitoring of internal backfilter chokes in case the EUT current goes up the integrated fans which are still in standby mode and at low EUT currents will Soeed up to improve cooling E Incase of intentional or unintentional overloading the CDN 3043 and 3063 series will automatically switch off EUT power in order to protect itself risk of fire Slow Damped Oscillatory Wave immunity testing of 3 Phase equipment needs a dedicated 3 Phase CDN Please check your Teseq equipment supplier for availability 14 2 1 CDN 3043 32 A series NSG 3040 on top of CDN 3043 Technical specifications Voltage ratings 280 VAC phase to neutral or phase to ground 480 VAC phase s to phase s up to 125 VDC full current range up to 225 VDC for max 7 A TASEO Advanced Test Solutions for EMC 105 106 Note The DC current capability derating is given by the specification of the Circuit breaker used to switch EUT power ON and OFF In case this internal EUT power ON OFF function is not used the DC current full range can be used for up to 350 VDC Name Max Current EFT Coupling Combined wave Ri
57. f GND 91 L GND N GND PE GND L N GND L PEa GND N PE a GND Line to line 2 Q L AN L PE N aPE EC EN 61000 4 5 Lines to ground 12 0 L aPE N aPE L N aPE EC EN 61000 4 11 4 29 Dips amp interrupts to phase L TASEO Advanced Test Solutions for EMC 92 11 VARIOUS NSG 3040 VERSIONS E Thanks to a very flexible design concept NSG 3040 is available in several con figurations in order to cover every need between a high end wide applica tion coverage solution multifunction generator and dedicated single function instrument 11 1 NSG 3040 IEC NSG 3040 IEC is the high end configuration It is fitted with pulse modules for dips interrupts combined wave surge and burst EFT It includes a single phase 16 ACDN and the Teseq Standard User interface SUI featuring 7 2 colour touch display start pause and stop buttons and scalable rotary encoder NSG 3040 11 2 NSG 3040 a la carte customer specific The model presented above is available in almost any configuration maintaining the fact that the mainframe is prepared for easy fit plug and play of any module allowing easy upgrade NSG 3040 EMC test system 11 2 1 Mainframe NSG 3040 MF 93 The NSG 3040 MF is wired configured and tested for easy integration of all pulse modules It includes following parts 19 EMC Housing with front rear panels internal mechanics wirings and plugs 7 2 color display Tou
58. generation of defined interference signals for EMI immunity testing Depending on the arrangement of the test rig the configuration the cabling and the properties of the EUT itself a significant amount of electromagnetic radiation may result that could also affect other equipment and systems The user himself or herself is ultimately responsible for the correct and controlled operation of the rig In case of doubt the tests should be carried out in a Faraday cage Place and Date Luterbach December 4 2013 lt Sse Jghannes Schmid President NSG 3040 EMC test system O 14 ACCESSORIES 14 1 PC software WIN3000 WIN 3000 remote software is a comprehensive program designed to create test libraries for the surge burst PQT magnetic field and SOW tests that can be performed with Teseq s NSG 3000 generator series and its accessories WIN 3000 comes on a CD ROM included in each NSG package or can be down loaded from the Teseq web site Insert the CD ROM and double click on setup exe and follow the instructions on the screen The required communication cable Crossover S FTP cable is part of the delivery All required documentation is available on the CD ROM in PDF file format Consult first the document Software Version History Vx yz to verify which FW and SUI version you may need to install for a proper function of the generator WIN 3000 requires always the corresponding FW and SUI software The prop
59. he safety banana con nectors of the shorting cable to the HV output of the generator For monitoring the EUT current during a test an additional IEC adaptor with the safety banana connectors can be connected to the generator EUT output for observation of one lead at a time NSG 3040 EMC test system Parameter Max peak current Max RMS current Nominal ratio Sensitivity Hole diameter Probe connector Scope coax cable Operating temperature Output impedance Accuracy MD 310 set Options INA 6560 INA 2042 INA 6554 Value 147 400 Amp 10 Amp 10 1 into 1 MQ system 20 1 into 50 Q system 0 1 V Amp 1 MQ system 0 05 V Amp 50 Q system 6 3mm SMA with SMA and BNC 0 to 65 C 500 1 0 Carry case Current probe coax cable with SMA BNC connector shorting cable with safety banana connectors calibration certificate user manual FISCHER to banana plug adaptor set LEMO to banana plug adaptor set IEC 320 single phase to safety banana adaptor leads 2 x 155 131 6 to 4 mm adaptors with safety banana connectors Note The carry case provides spare place for all options TASEO Advanced Test Solutions for EMC 148 14 7 4 Burst EFT pulse verification kit The Teseq CAS 3025 burst EFT pulse verification kit has been specially designed to comply with the new requirements of IEC EN 61000 4 4 2004 to enable EMC engineers to verify their burst EFT test generators periodically Annual calibrat
60. iation tests are specified in chapter 5 2 of IEC 61000 4 11 and are available with NSG 3040 provided an automatic variac is detected by the system software Description of voltage variation test extract of IEC 61000 4 11 4 Ur r m s 100 70 4 0 Key ty Time for decreasing voltage t Time for increasing voltage ts Time at reduced voltage TASEO Advanced Test Solutions for EMC 112 The respective test screen looks like what follows Voltage Variation test eel lene Can Bo 1 cvel Phase 0 synen Ti 2 25 cv pee 10 io arul M o E 14 3 2 Manual step transformer INA 6501 The step transformer type INA 6501 is a standard accessory for the Schaff ner Modula 6100 instrumentation series It provides a convenient means for reducing the incoming supply voltage by pre set amounts It is required for power quality testing PQT and is fully compliant with the latest revisions of IEC 61000 4 11 2004 ON OFF TASEO INA 6501 STEPTRANSFORMER 16A 250V To NSG 3040 EMC test system It is fitted with carrying handles as part of its overall good ergonomic design 113 which makes for ease of handling Further the unit may be used in any of three operating positions laying or standing on a work bench or for more permanent applications it can be wall mounted Care has to be taken in case of use in standing posi tion as the stability is limited The cabling
61. ice e g motor circuit breaker relay fluorescent lamp etc is switched off This type of interference can affect other equipment in either of following two ways Firstly the interference can be coupled directly into the target equipment via the mains power cable The interference can be transmitted from the source along the mains power cable connected to the target Interference from the mains can reach any other piece of equipment connected to the same power source in a similar way however this does not all have to occur in the same section of a building Alternatively the interference can be capacitively coupled into any target device in the vicinity The system enables a test to be performed using both standardized coupling NSG 3040 EMC test system methods The EUT is connected to the mains power socket on the front panel of the test system for the direct mains injection test Capacitively coupled tests require the interference to be superimposed onto the signal or data line cables via an external coupling clamp that is connected to the burst output on the front panel of the system 3 2 Combination wave test The surge test in compliance with IEC EN 61000 4 5 duplicates high voltage high energy interference as experienced with a lightning strike Generally speak ing the interference finds its way into household equipment via the mains power supply This kind of interference can affect equipment in either of two ways Firs
62. ied in IEC EN 61000 4 5 ANSI C62 41 and their derivates The main advantage of the MD 300 current probe is that the measuring system is physically isolated from the circuit under test The MD 300 current probe is ready to use as coming along with pre mounted coaxial cable The BNC end plug needs to be connected to the high impedance input or 50 Q input of an ordinary memory oscilloscope Then the conductor carrying the surge current to be measured is passed through the hole in the current probe The resulting voltage wave shape on the oscilloscope will then be an authentically reproduction of the actual current wave shape within the given accuracy NSG 3040 EMC test system The probe can be used for current pulse verification on surge generators 145 Optional FISCHER or LEMO connectors are available for matching the safety banana connectors of the shorting cable to the HV output of the generator For monitoring the EUT current during a test an additional IEC adaptor with the safety banana connectors can be connected to the generator EUT output for observation of one lead at a time Technical specifications Max peak current Max RMS current Nominal ratio Sensitivity Hole diameter Probe connector Scope coax cable Operating temperature Output impedance Accuracy MD 300 set Options INA 6560 INA 2042 INA 6554 5000 Amp gt 63 Amp 500 1 into 1 MQ system 1000 1 into 50 Q system 0 002 V Amp M
63. ield The burst time may be entered using the wheel or the keypad Touch the units button ms in the example to set the time unit Time units are s ms us and spikes 8 3 9 Repetition time Touch the Repetition time button 300 in the example to set the test repeti tion time A red frame is displayed around the field The repetition time may be entered using the wheel or the keypad Touch the units button ms in the example to set the time unit Time units are s and ms Note The repetition time must be shorter than the test duration 8 3 10 Test duration Touch the Test Duration button 120 in the example to set the test dura tion time A red frame is displayed around the field The duration time may be entered using the wheel or the keypad Touch the units button s in the example to set the time unit Time units are s min h and cont continuous TASEO Advanced Test Solutions for EMC 61 62 8 3 11 Burst generator technical data Parameter Value Pulse amplitude 200 V to 4 8 kV in 1 V steps open circuit 100 V to 2 4 kV 50 matching system Voltage step 1 V 10 V 100 V Polarity Positive negative alternate Frequency HZ 100 99 999 kHz 1 TOO Phase Asynchronous synchronous 0 to 359 in 1 steps Coupling ANSI IEC external manual Burst time Us 1991999 ms 1 99 999 S 1 1 999 Spike 1 1000 Repetition time ms 1 99 999 Si 1 4 200 70 m
64. ill be first executed Touch the voltage button 200 V in the example to enter the test voltage A red frame is displayed around the field The voltage value may be entered using the wheel or the keypad 8 4 4 Impedance Touch the impedance button 2 ohms in the example it will repetitively change between 2 and 12 Q 8 4 5 Phase Touch the Synch Asynch button Asynch in the example to activate the syn chronization of test pulses to the EUT mains frequency When this button is set to Asynch the phase value button in the example will display When this button is set to Synch the user must also set the phase value TASEO Advanced Test Solutions for EMC 69 70 To set the phase value touch the phase value button A red frame is displayed around the field The phase value may be entered using the wheel or the keypad The value is in degree units and may range from 0 to 359 Synch mode is only available if the EUT power is switched on 8 4 6 Coupling Touch the coupling mode button to select SURGE OUTPUT MANUAL CDN or IEC COUPLING Surge output Select SURGE OUTPUT when a pulse is to be applied directly to the EUT for example in component testing of non powered EUTS Manual CDN This setting will compensate the loss of an external manual CDN such as the CDN 3083 or CDN 117 The internal impedance will be reduced by 0 37 Q IEC coupling When IEC coupling is selected the
65. in Test duration S 1 99 999 min 1 99 999 h 1 1O00 Continuous 8 3 12 Derating Some parameter combinations will not be accepted due to the power limitation of the HV power supply The following error message will be displayed when an invalid combination of parameters is entered Communication Error accept parameter NACK 13 UNSUCCESSFUL COMMAND Invalid parameter error message NSG 3040 EMC test system The following graphs show the relationship between the voltage trep tburseand frequency and show the range of possible parameter combinations that can be used in testing Each graph includes two voltage settings which are shown in different line thicknesses in relation to the trep values given for 20 10 5 2 1 0 5 0 2 and 0 1 ms The appropriate trep value bold trep for the bold line are labeled on the border of the graph Combinations of values that are below the line are allowed TASEO Advanced Test Solutions for EMC 63 a QD ODD DO Wu ae Soe eS co NT aie 7 7 YANNAN A 7 Ae A Ai H ff H vi TM MA O SS SS NO Se N SS SS SEEESEE ES Sune Sun ud oo NSG 3040 EMC test system 65 AY oz MO E ZH
66. ins socket and is used as the 100 reference point for voltage variation tests Touch the Voltage Uin button 230 in the example Use the wheel or keypad to set the input voltage Uin setting will be saved and is valid for all following tests Uin are changeable via WIN 3000 dialogue to be used in sequence mode EXIT Touch the Exit button to return to the system window without saving settings EUT ON OFF The EUT ON OFF button is used only when an option with a built in EUT switch such as an INA 6502 a CDN 3043 or a VAR 3005 is connected to the NSG 3040 The NSG 3040 itself does not have an EUT switch Touching the button will turn the EUT switch on or off FACTORY SETTINGS Touch the FACTORY SETTINGS button to reset the properties associated with each of the buttons in the general settings window to the original factory set tings OK Touch the OK button to save all settings and return to the system window NSG 3040 EMC test system 7 2 2 EQUIPMENT screen Equipment detail SUI 3000 080313 NA NA NA NA MODMC_MU 0001 23A 357 4 5 2007 4 5 2007 V Bayer HYS6601 0001 14g 1 1 1 2003 1 1 2003 V Bayer EFT6601 0001 14g 14 1 1 2003 1 1 2003 V Bayer RW6601 0001 14k 000000 1 1 2003 1 1 2003 V Bayer Equipment window Touch the Equipment button to access a list of all internal and external genera tor modules including firmware versions serial numbers calibration dates and certificate
67. ion Operating temperature Overload protection Weight Dimensions Control cable Value lt 8 nominal lt 3 5 at full range Selectable 50 and 60 Hz 3 Software driven 80 to 400 mA into INA 702 Cf 9 8 gt allows 0 8 to 4 A m 80 to 440 mA into INA 701 Cf 0 89 gt allows 0 08 to 0 4 A m INTO INA 703 200 mA to 4 1 A into INA 702 Cf 9 8 gt allows 2 40 A m 200 mA to 4 1 A Into INA 701 Cf 0 89 gt allows 0 2 3 6 A m 90 to 240 V lt 150 W 5 40 C By temperature sensor on power stage 4 2 kg approx 195 x 180 x 380 mm 2 meter 25 way sub D twisted pair shielded incl in delivery Typical for the full range from standard level 1 lowest standard level to full range level X Current adjustment through customer provided amp meter NSG 3040 EMC test system Indicated max values reachable for environmental tem 133 peratures below 30 C For higher environment tem peratures internal temperature sensor might trip after a few minutes Power LED green shows if instrument is powered up Error LED red ERROR LED off No problem accessory is ready to run ERROR LED blinking Problem able to be solved by user Ex Interlock is activated emergency button is pressed overtemperature ERROR LED on Problem which needs module repair please contact your nearest Teseq customer support center or sales representative The equipment should be switch
68. ion and periodic verification The annual calibration of test equipment recommended by most quality systems ISO 9000 ISO 17025 etc has to be considered as a validation of all measurements done since the last calibration Many EMC standards call for a verification of the test equipment before and after every test session If the verification shows differing results no valid test results can be assumed and the test equipment has to be re calibrated It is therefore highly recommended that the EMC test engineer periodically verifies his test equipment in order to ensure good functionality and accuracy NSG 3040 EMC test system and hence minimise the risk of bad measurements and the need for a product re call Periodic verification can be done before a test session or once a day or week or month this is up to the user to decide Only a few points need to be checked which will take only a few minutes if the right test equipment is available The Teseq CAS 3025 comprises two termination attenuators INA 265B and INA 266A plus a coaxial RG58 cable and calibration certificate indicating the precise ratio The whole is delivered in a handy case Technical specifications INA 265B termination attenuation typical 50 Q 1 1000 INA 266A termination attenuation typical 1000 Q 1 2000 Bandwith 400 MHz Max input burst peak voltage 8800 V peak Operating temperature 10 to 40 C Dimensions LXWXH 280 x 230 x 85 mm Weight
69. is in one box and powered from a single mains The use of a motorised variac as VAR 3005 also allows running variation tests which are slower changes in EUT supply voltage Using DC supplies instead of AC supplies allows to test DC powered EUTs on a similar way This is in line with the specifications of IEC 61000 4 29 NSG 3040 EMC test system 8 5 1 Examples of dips amp interrupts a Voltage dip of 30 70 b Voltage dip of 60 40 4 7 c Voltage dip of 100 73 1 t cycles 8 5 2 Dips and interrupts generator Dips and Drops Window Voltage Uvar _s 0 Phase aynen TEvent a 1 me Repetition Test Time i 10 0 Duration 3 Pulse z ES H o Dips and interrupts window gt t cycles TASEO Advanced Test Solutions for EMC 74 8 5 3 Voltage U Var If no automatic variac or automatic transformer i dip or interrupt will always occur to 0 Touchi change from to Volts If an automatic variac or automatic transforme s connected then the voltage ng the units repetitively it will r is connected then the field Voltage Uvar enables to set the dip voltage level If a manual voltage source is connected then the dips interrupts level will follow the manually set voltage at the EUT input nevertheless this field will be inactive 8 5 4 Phase Touching the Phase field it will come up with a red frame to indicate the selec
70. ivered 1 NSG 3040 generator 2 User manual may be a pdf on WIN 3000 CD 3 1 Mains power cable for the test system 4 1 Dummy plug interlock blind connector 5 1 Grounding strip 10 cm 6 1 EUT power input connector with cable 7 1 EUT power output connector 8 WIN 3000 CD and LAN crossover cable 9 Optional items as ordered Check the instrument for signs of transport damage Any damage should be reported to the transportation company immediately NSG 3040 EMC test system 5 1 Installation of the NSG 3040 system 23 The mains power voltage indicated on the instrument must correnspond with the local supply voltage mains voltage 85 265 VAC universal power unit mains frequency 50 60 HZ pessoosesessese M mM Mains switch Fuse holder with fuses 2 x 3 15 AT E Mains power input Mains switch fuse holder and power input To replace a fuse 1 Disconnect the mains cable 2 Pull the fuse holder out of the connector 3 Remove the damaged fuse s 4 Insert 1 or 2 x 3 15 AT fuses R oO Replace the fuse holder 6 Plug the mains cable into a power outlet with a solid ground connection 7 Switch the system on and operate as instructed in this manual free space around the cooling air inlets on both sides NOTE Place the test system so that there is sufficient and behind the fan outlet on the rear panel Emergency Stop device make sure to place the system such as the operator has quick
71. kHz 3 Phase power lines level 1 up to level 4 5 KHz 3 Phase power lines level 1 up to level 4 100 kHz Capacitive coupling clamp level 1 up to level 4 5 KHz Capacitive coupling clamp level 1 up to level 4 100 KHz Combination wave Surge IEC 61000 4 5 1 2 50 us amp 8 20 Us 1 Phase power lines L N coupling level 1 up to level 4 1 Phase power lines L PE coupling level 1 up to level 4 1 Phase power lines N PE coupling level 1 up to level 4 3 Phase power lines Lx Lx coupling level 1 up to level 4 3 Phase power lines Lx PE coupling level 1 up to level 4 DC Line L N coupling level 1 up to level 4 Unshielded unsymmetrical 1 0 lines level 1 up to level 4 Unshielded symmetrical communication lines level 1 up to level 4 Power magnetic field IEC 61000 4 8 50 HZ CF 9 8 level 1 up to level 4 60 HZ CF 9 8 level 1 up to level 4 Pulsed magnetic field IEC 61000 4 9 CF 0 98 level 3 up to level 5 CF 3 4 level 3 up to level 5 TASEO Advanced Test Solutions for EMC 54 Dips and Interrupts for AC power lines IEC 61000 4 11 50 Hz AC Power 60 Hz AC Power 50 Hz AC Power 250 Cycle 60 Hz AC Power 300 Cycle 50 Hz AC Power 50 Hz AC Power 60 Hz AC Power 60 Hz AC Power 50 Hz Voltage vari 60 Hz Voltage vari Lines Class 2 Dips 0 0 5 Cycle dips up to 25 Cycle Lines Class 2 Dips 0 0 5 Cycle dips up to 30 Cycle Lines Class 3 Dips 0 40 70 80 0 5 Cycle dips up to Lines Class 3 Dips 0 40 70 80
72. l EUT voltage when the AC EUT input supply is connected and EUT power is switched On When the input supply is not connected and or the EUT is switched off these fields will display NA The EUT Supply frequency field shows the measured frequency of the EUT supply voltage Test Action at EUT Fail Input Touch the Test Action at EUT Fail Input button Stop in the example to specify the test action taken if the EUT fail input on system Interface port is activated When the button is set to Stop and the EUT fail input is activated the test stops The test can be restarted by pressing the Start key on the front panel When the button is set to Pause and the EUT fail input is activated the test goes into pause mode The test can be continued by pressing the Start key NSG 3040 EMC test system on the front panel When the button is set to CONT the test will continue even if the EUT fail EUT Power Supply at EUT Fail Input Touch the EUT Power Supply at EUT Fail Input button not shown on example to specify the action taken if an EUT fail signal is generated When the button is set to On EUT power stays ON after the EUT fail Input is activated When the button is set to Off EUT power shuts down when the EUT fail nput is activated EXIT Touch the Exit button to return to the system window without saving changes EUT ON OFF
73. ll always show External in the field for Voltage Uvar t is up to the user to make sure that the right voltages are set on the manual TASEO Advanced Test Solutions for EMC 116 14 3 3 Manual step transformer INA 6502 The step transformer type INA 6502 is a Standard accessory for the Schaffner NSG 3040 instrumentation series It provides a convenient means of reducing the incoming supply voltage by pre set amounts It is required for power quality testing PQT and is fully compliant with the latest revision of IEC 61000 4 11 2004 o e ON OFF TASEO INA 6501 STEPTRANSFORMER 16A 250 Its control is fully automatic driven from NSG 3040 Once detected by the NSG 3040 and declared to the functions offered by INA 6502 are available in the software 1 Connect INA 6501 EUT power out to NSG 3040 EUT power input 2 Connect INA 6501 EUT power in to mains using EUT power in cable delivered with NSG 3040 3 Connect this connector to X2 of INA 6502 So the settings 0 40 70 80 will appear as well as the possibility to switch EUT power on off INA 6502 comes fitted with carrying handles as part of it s overall good ergo nomic design which makes for ease of handling Further the unit may be used in any of two operating positions laying on a work bench or for more perma nent applications it can be wall mounted NSG 3040 EMC test system The unit has been designed for use in rugged industrial en
74. lse generating module In case an invalid combination of parameters was entered an error message will be displayed when the test is started TASEO Advanced Test Solutions for EMC 83 84 Following derating must be considered 100 kHz Mode 120 110 100 90 80 70 60 50 40 3000 3200 3400 3600 3800 4000 4200 4400 Pulse Voltage V Burst Frequency 1 s Burst frequency 100 kHz Pulse 100 3300 V wo o 1 ies o fi aD fi u o 3000 3200 3400 3600 3800 4000 4200 4400 Pulse Voltage V Burst Dur Rep Time 3 Burst Duration Repetition Time 100 kHz Pulse NSG 3040 EMC test system 600 85 580 560 540 520 500 480 460 Burst Frequency 1 s 440 420 400 T T T T T T 3000 3200 3400 3600 3800 4000 4200 4400 Pulse Voltage V Burst frequency 1 MHz Pulse 100 3300 V wo fi 80 70 4 60 Burst Dur Rep Time 50 T T T T T T 3000 3200 3400 3600 3800 4000 4200 4400 Pulse Voltage V Burst Duration Repetition Time 1 MHz Pulse TASEO Advanced Test Solutions for EMC 86 O 9 DESCRIPTION OF THE 25 PIN D SUB SIGNALS when connecting signals to this port As the whole system generates disturbances in order to avoid auto disturbing all wires connected to this port should be properly shielded the shield of the cable not serving as signal return path the shield to be connected via a large surface to
75. module FTM 3425 NSG 3040 xxx ERC series NSG 3040 xxx EPO series NSG 3040 DDV NSG 3040 SOW Maintenance and function check General Cleaning Function check Calibration Warranty Declaration of conformity CE Accessories PC software Coupling decoupling networks for multiple phases higher currents and voltages CDN 3043 32 A series CDN 3063 series 63 A and 100 A series Variable voltage source Automatic Variacs anual step transformer INA 6501 anual step transformer INA 6502 agnetic field options anual solution MFO 6501 Automatic solution MFO 6502 Pulse wave shape adapter INA 752 NSG 3040 EMC test system 88 88 89 90 92 92 92 93 93 94 94 94 94 96 97 98 99 99 99 100 100 101 102 103 103 104 105 106 107 107 112 116 121 125 129 134 14 6 14 6 1 14 6 2 14 6 3 14 7 14 7 1 14 7 2 14 7 3 14 7 4 14 8 14 8 1 14 8 2 14 8 3 14 9 15 16 Coupling decoupling networks for data lines Burst EFT coupling clamp NSG 3425 and safety cover INA 3825 Surge CDN for unsymetic datalines CDN 117 urge pulse CDN for symmetric datalines CDN 118 easuring accessories D 200 and MD 200A differential high voltage probes D 300 surge pulse current probe set D 310 SOW pulse current probe set Burst EFT pulse verification kit Cables plugs and adapters Calibration adapters Test adapters Various cables and plugs Mounting accessories System description Addresses D
76. n EUT power On Expert mode Off FACTORY SETTINGS T a E General settings window when an EUT power switch has been detected General settings Beeper volume off voltage 230 v Interlock action Eup pavar EUT OFF is Expert mode FACTORY SETTINGS ok A ne General settings window when automated variac is connected Beeper volume During the surge test there is a beep sound to alert the user Touch the Beeper volume button to switch the sound on and off Default setting is On for safety purpose The red vertical bar on the right side of the General settings window displays 4 buttons Exit EUT OFF ON Factory Settings and OK Interlock action Touch the Interlock action button EUT power On in the example to keep EUT power on when the interlock is activated or to have it automatically shut off EUT power Off when the interlock is activated TASEO Advanced Test Solutions for EMC 38 Expert mode Change the Expert mode status to Active to change parameters during a running test When the button is set to Off parameters can be changed only when the NSG 3040 is in Stop mode Expert mode is only available for burst pulses EFT Voltage U in This button is active only when an optional automated VAR 6502 or VAR 3005 variac is connected to the NSG 3040 The value entered in this field is the voltage measured at the ma
77. n Faded generator icons Telecom 10 700 us pulse and voltage variation mean that the generator is configured to generate those pulses but the proper unit is not connected In the red vertical bar there are three buttons System Reset Interlock and Remote Touching the reset interlock button will close the interlock The inter lock link must be closed before starting a test Touch Remote button to enter remote controlled screen No inputs via touch panel are possible The NSG can now be controlled via WIN 3000 remote control software Touch Exit on screen and in WIN 3000 to use NSG manually TASEO Advanced Test Solutions for EMC 35 36 7 2 System window Touch the System button to display the System window System window System window The System window displays 4 buttons GENERAL EQUIPMENT COMMU NICATION and MONITORING In the red bar there are two buttons FACTORY SETTINGS and EXIT FACTORY SETTINGS Touch the FACTORY SETTINGS button to reset the properties associated with each of the buttons in the System window to the original factory settings EXIT Touch the EXIT button to return to the main menu 7 2 1 GENERAL settings General settings Beeper volume On Expert mode off General settings window when no optional hardware CDN variac etc connected NSG 3040 EMC test system General settings 37 Beeper volume EUT OFF Interlock action O
78. n only be resetted in Teseq service centers Therefor it is strongly recommended to leave the factory set IP and to install INA 3011 option on the user PC The second IP address dedicated to the NSG 3040 control may be set to the fix IP address 10 10 10 11 refer to quick installation guide and so will not interfere with the PC network settings C TASEO Advanced Test Solutions for EMC 96 11 4 NSG 3040 xxx EPO series EPO stands for Exclusive Pulse Output These special versions are made for the users who use the instrument together with an external CDN from the CDN 3043 3063 or 3083 model range in which case they may not need the built in single phase CDN 3041 NSG 3040 EMC test system 11 5 NSG 3040 DDV 97 DDV stands for Dips Drops Interrupts and Variations The NSG 3040 DDV is a single function generator made for Dips Interrupts and Variations testing For interrupts and variations testing a variable voltage source is required This is available from TESEQ in different versions as accessories INA 6501 Manual Step transformer 0 40 70 80 levels INA 6502 Automatic Step transformer 0 40 70 80 levels VAR 3005 S16 Automatic variac VAR 3005 D16 Automatic double variac See section 14 Accessories for more detailed information TASEO Advanced Test Solutions for EMC 98 11 6 NSG 3040 SOW SOW stands for Slow damped Oscillatory Wave The
79. ng construction allows the operator to make use of both back brackets as well as the handles NSG 3040 EMC test system 6 MAINFRAME DESCRIPTION 25 O E The housing of the NSG 3040 is specially designed for EMC application and is EMC approved 6 1 Front panel E Color touch screen E LEDs Wheel sensitivity keys Wheel Surge il Start stop pause keys output or High frequency ground point SOW output 6 1 1 EUT output This is the power output connection for the EUT An EUT mains power connector is included with the system The connector contains a phase pin L Live Neutral pin N and a ground pin for connection of the EUT The pins in the connector must be correctly wired to the corresponding conductors in the EUT power cable If the test system is connected to a DC power source as supply for the EUT the user must ensure that the polarity at this connector corresponds with that at the EUT power connector TASEO Advanced Test Solutions for EMC 26 EUT output connection Note For DC power supply L positive N negative The pins in the connector are designed for a maximum current of 16 A WARNING Never attempt to connect or disconnect an EUT while a test is being performed 6 1 2 High frequency ground terminal This terminal provides a solid high frequency ground connection point to the test system If an external CDN is
80. ng during late the kind of stray fields that occur ines MFO 6502 current sources generates these test conditions in accordance with the IEC 61000 4 8 standard by inducing magnetic field produced is proportional to the current within the loop parameters IEC 61000 4 8 specifies a clean sine wave to be used THD lt 8 This is met thanks to the use of a synthetic signal tamplifier Other advantage of this solu be generated by the same instrument ulate the type of field produced surge ightning strokes on buildings and other metallic structures such as free stand networks etc ing masts lightning conductors earth NSG 3040 generates these test signals in accordance with the IEC 61000 4 9 standard by inducing a current generat magnetic field loop in which the magne current within the loop parameters ed by the surge module CWM 3450 into tic field produced in proportional to the he loop antenna while magnetic It is recommended for the user to stay away at least a few meters from t fields are generated Also keep away magnetic field sen sitive devices and items such as credit cards magnetic key cards etc which might be influencedby the field TASEO Advanced Test Solutions for EMC 121 122 Magnetic field loops INA 701 702 and INA 703 Tests with mains frequency and pulsed magnetic fields are performed using the magnetic field loops designed for NSG 3040 These are rectangular loops meas
81. ng wave A surge coupling surge coupling CDN 3043 B32 32 x CDN 3043 S32 32 X X CDN 3043 C32 32 x X X 14 2 2 CDN 3063 series 63 A and 100 A series Technical specifications Voltage ratings 280 VAC phase to neutral or phase to ground 480 VAC phase s to phase s up to 125 VDC full current range up to 225 VDC for max 7 A Note The DC current capability derating is given by the specification of the Circuit breaker used to switch EUT power ON and OFF In case this internal EUT power ON OFF function is not used the DC current full range can be used for up to 350 VDC Name Max Current EFT Coupling Combined wave Ring wave A surge coupling surge coupling CDN 3063 S63 63 x x CDN 3063 S100 100 x x NSG 3040 EMC test system 14 3 Variable voltage sources 14 3 1 Automatic Variacs The automated variable transformer VAR 3005 series is a standard accessory for the Teseq NSG 3040 and NSG 3060 CDN 3061 instrumentation In combination with a PQT module it provides a convenient means for reducing the incoming supply voltage by adjusting the incoming EUT supply voltage to arbitrary voltages The VAR 3005 comes in two different versions as double source VAR 3005 D16 where two supply sources are required to test equipment with universal power supplies and as single source VAR 3005 S16 providing best price performance for applications where dual source is not required mains sup
82. nterference that simulate the interfer ence that is generated when inductively loaded switches are operated With their very steep rising and falling edges these interference pulses spread over a frequency spectrum of over 300 MHz and may occur wherever electrical currents are switched off in connection with motors circuit breakers relays fluorescent lamps etc Therefore nearly all the relevant standards concerning the testing of electronic equipment require the performance of burst tests TASEO Advanced Test Solutions for EMC 57 58 8 3 1 Test configuration with power line coupling In a power line coupling test the NSG 3040 generates the interference signal which is Superimposed on the EUT power signal 8 3 2 Test configuration with external coupling In an externally coupled test the interference signal is delivered through the NSG 3040 s coaxial burst output connector SHV type on the front panel and fed to an external coupling clamp The signal is then applied to signal or data line cables The same SHV type connector may also be used for connection of a 3 phase CDN or for a CDN suitable for 1 phase gt 16 A and all other CDNs with a minimum 400 MHz digital oscilloscope to accu i NOTE A Teseq CAS 3025 calibration set must be used rately verify the EFT pulse parameters Single pulse Pulse burst V 100 90 V 50 10 i ma p 4 t es E lt 20 Tae f Burst i rep
83. numbers The red vertical bar on the right of the equipment window displays three buttons Exit Up and Down EXIT Touch the Exit button to return to the system window UP DOWN If the system includes more than 5 modules touch the Up and Down arrows to scroll through the list Viewing the current SUI version See entry starting with SUI 3000 under column FW Version in the example above 080313 TASEO Advanced Test Solutions for EMC 40 7 2 3 COMMUNICATION screen Communication aes 172 20 65 32 SubNet 255 0 0 0 Port 1025 Gateway 0 0 0 0 MAC Address i 00 0C D2 00 03 57 Communication window Touch the Communication button to view and enter the network address information required to integrate the NSG 3040 into a local area network or connect it to a PC By touch the IP address SubNet Port or Gateway field the key board will appear and the new numbers can be added To enter a new address only the number key and the dot may be used After touching Enter the keypad will close and the new setting are saved The Del key will delete all text entered The backspace button lt will delete the last letter entered Touch the cancel button to return to the test parameter window without saving the parameters IP address An IP address Internet protocol address is a unique address that certain elec tronic devices use to identify and
84. o replace the generator cover and side panels 8 Restart the NSG 3040 The new software version will boot automatically and may be verified in the equipment detail window see section 7 7 1 NSG 3040 EMC test system Removing the NSG 3040 side panels and cover The SD card is placed on the upper right position NSG 3040 SD card slot TASEO Advanced Test Solutions for EMC 45 Removing the SD card amp SUI3000 DE File Edit view Favorites Tools Help Ar Address Q F AutoCopy Program Files SUI3000 x Go Folders Name Size Type Date Modified B S Removable Disk F Ah surzoooaP 15 546 KB Application 19 05 2008 13 11 amp O Autocopy J Program Files surs000 Windows explorer displaying the SUI program filename SUI3000AP EXE on the SD card removable disk F ae NOTE Do not change the SUI program filename NSG 3040 EMC test system 8 PARAMETER SETTING WINDOW 47 E The main menu displays a button for every type of test that can be performed by the NSG 3040 Buttons for tests that are not available on the system as configured are greyed out The user can set parameters for available tests and create new tests in the test parameter window The next figure shows the test parameter window for burst tests While the input fields differ for each type of test the red side bar and bottom bar remain the same Burst window ANSI coupling aaa Volt P
85. omplies to the requirements of IEC 61000 4 9 The control is fully automatic driven from NSG 3040 Click on following icon PULSED MAGNETIC FIELD NSG 3040 EMC test system Following test screen will appear Pulsed Magnetic Field test Field Strenght i Alt 1 A m Impedance 20 Volts to A m Ratio 3 50 Repetition Time sol s SHOW STEPS 135 Test Phase p Asynch Duration LOAD LOAD 23 es Ou m E 10 pu Once the right Volts to A m ratio which is available on the INA 752 as well then in its calibration certificate is entered in its respective field the user will be able to enter the required test level directly in A m no need for him to proceed with calculations the instrument software does the job In case an INA 702 loop antenna is used the termination plug labelled Pulse needs to be used Technical specifications NSG 3040 CWM 3450 INA 752 INA 701 INA 702 Parameter Volts to A m ratio Magnetic field adjustment INA 752 weight INA 752 dimensions Value 3155 Software driven NSG 3040 settings 200 to 4400 V gt allows 60 to 1200 A m 0 6 kg 140 x 75 X 55 Mmm Typical exact value is given on INA 752 front panel TASEO Advanced Test Solutions for EMC 136 14 6 Coupling decoupling networks for data lines 14 6 1 Burst EFT coupling clamp NSG 3425 and safety cover INA 3825 The EFT bursts coupling clamp CDN 3425 is designed for the injec
86. or fields up to 40 A m It complies to the requirements of IEC 61000 4 8 THSEO ogenon UJ t is fitted with carrying handles as part of its overall good ergonomic design which makes for ease of handling Further the unit may be used in any of two operating positions laying on a work bench or for more permanent applica tions it can be wall mounted ts control is fully automatic driven from NSG 3040 Once detected by the NSG 3040 the functions offered by MFO 6502 are available in the software Following icon will be darkened showing the functions are active A POWER MAGNETIC soaoHz FIELD TASEO Advanced Test Solutions for EMC 129 130 The coil factor of the used loop antenna is to be entered in the respective field then the user will setup his tests directly in A m the software makes the calculation and drives the MFO 6502 to generate the right current through the oop antenna Power Line Magnetic Field test Field Coil Strenght ai 1 Alm Factor 0 9 Frequency sonz ea 10 s E o Two safety banana sockets red and black provide a convenient means to connect the loop antenna two other ones green shorted by jumper to connect an external amp meter for verifying or to calibrate the generated current as the field generated in the loop antenna is directly proportional to the current flowing through it Field strength A m H Cf x Where H is the generated field Cf the coil
87. os 200 V Burst Time il fe Eur oFF Frequency 100 Hz Aopen ms Test SHOW STEPS He ad a Soan Duration i s ano ste Bottom bar z a an Example of the burst test window showing the red bar and bottom bar Red bar 8 1 The red menu bar EXIT Touch the Exit button to return to the system window without saving settings TASEO Advanced Test Solutions for EMC 48 EUT OFF EUT ON Touch the EUT Off EUT On button to switch EUT power off or on Note The EUT power function can work only in combination with an automated accessory Such as a variac step transformer or a RAMP VALUE utomated CDN The Ramp value button is active only if a rampable parameter in the test window is selected All rampable parameters are identified by a small gray ramp icon This icon will turn red when a parameter is ramped Voltage Ramping Ramping Mode Step Delay 1 s E Start 200 y Stop 4800 1 1 Step Ramping window for voltage parameter E Ramping mode Touch the Ramping mode button Static in the example to change the ramping mode from static to linear In linear mode the Step values E Start Touch the Start button user can Set Start Stop and 200 V in the example A red frame is displayed around the field Enter the Start value using either the wh E Stop Touch the Stop button eel or the keypad 4800 V in the example A red
88. ossible to superim pose the interference signal as specified in the standards on communication cables and other kinds of data lines The same coaxial HV output sockets may also be used for connection to al other CDNs max 30 Front time T1 1 67 X T 1 2 US 30 Time to half value T2 50 us 20 Wave shape of open circuit voltage 1 2 50 us wave shape definition according to IEC EN 61000 4 5 TASEO Advanced Test Solutions for EMC 67 68 Front tim max 30 e T1 1 25 X T 8 US 20 Time to half value T2 20 us 20 Wave sha to IEC EN pe of short circuit current 8 20 us wave shape definition according 61000 4 5 WARNING Using improper equipment when measuring surge pulses can result in personal injury or equipment damage NOTE Teseq recommends using a Teseq MD 200 or MD 200 A differential probe in combination with a Teseq INA 3236 Fischer to banana adapter for surge pulse verification NSG 3040 EMC test system Combination Wave Surge test ssil impedance 20 Repetition Li he Phase asmen peer tor toa ae he Os a CW Parameter window ADD STEP 8 4 3 Voltage Touch the polarity button ALT in the example to select test polarity Polarity values are positive POS negative NEG or alternating ALT On odd pulse number there will be one pulse less in negative then in positive Positive pulse w
89. ply of equipment under test is a fixed value The VAR 3005 option is required for power quality testing PQT dips and inter rupts and is compliant with the latest revision of IEC EN 61000 4 11 2004 including the variation test The VAR 3005 units are fully automatic controlled driven from your NSG 3xxx generator using the touch screen interface SUI or the WIN3000 software application VAR 3005 is plug and play technology it auto configures and avoids the user to set voltages out of range To prevent incorrect testing the phase neutral and earth line of EUT IN power line is observed and the 50 60 Hz frequency range will be set automatically This feature helps especially in case where cycle parameter is set in a test procedure Once detected by the NSG 3xxx generator all functions offered by the VAR 3005 are available including the possibility to switch EUT power on off EUT power can be switched ON and OFF manually per switch on the front panel or remotely from the NSG 3xxx front panel or PC control software EUT power can be switched off automatically at test end per sequencing program control For safety reasons EUT power will switch off automatically in case of overload The VAR 3005 can be connected either via a NSG 3040 with its internal coupling device or via the NSG 3060 in combination with a CDN 3061 and the built in power quality PQT module The EUT input frequency will be detected automati cally for a corre
90. provide a convenient means of reducing the incoming supply voltage Once detected the functions are available in the user interface software It s fully automatic controlled driven from NSG 3040 With the automatic step transformer INA 6502 the Uvar settings 0 40 70 80 wi Connecting th will be possib appear e single variac VAR 3005 S16 or VAR 6501 the settings of Uvar e in volts or of Uin Therefore Uin needs to be set first in the General settings menu Uin in this case is the actual input voltage of the single variac When using th e double variac VAR 3005 D16 or VAR 6502 it is important that Uin in the General setting gets set first before entering the variation screen The value of U in is variable with the double variac NSG 3040 EMC test system For proper operation of the plug and play detection 77 gt mechanisms it is strongly recommended to power on first the accessory and then the NSG 3040 main frame Powering on the NSG 3040 main frame before the acces sories may result in non detection of accessories More information about variable voltage sources is available in section 14 Accessories 8 6 Power Frequency Magnetic Field testing 4 8 parameter setting Power Line Magnetic Field test Field Coil Strenght a 30 Factor 0 89 7 s Frequency 50 Hz as 1o s ano sree _a ai Power Frequency Magnetic Field test window ge
91. re detail 6 2 6 Synchro Bus system This connection includes external device control and interlock capability If the NSG is used only as a stand alone unit the termination connector needs to be plugged otherwise the unit will not start All connected accessories will be detected automatically Written tests are linked with this accessories so if other accessory is connected it may get an error if the test contains not the suitable accessories Any automated CDN and complementary automated equipment like variac step transformer etc need to be linked together Thereby the termination connector needs to be moved to the system output plug of the last unit of the system The interfaces for the interbus interlock and synchro bus are bundled together in a sub D connector These three interfaces are looped through from one instrument to another NSG 3040 EMC test system NOTE Good EMC engineering practices should be applied when connecting signals to this port As the whole system generates disturbances in order to avoid auto disturbing all wires connected to this port should be properly shielded the shield of the cable should not serve as signal return path and the shield should be connected via a large surface to the conductive shell of the Sub D plug TASEO Advanced Test Solutions for EMC 33 34 7 THE STANDARD USER INTERFACE SUI E The NSG 3040 Standard User Interface SUI consists of A 7 color touch pan
92. rference signals for interference immunity testing the requirements in the IEC EN 61000 series concerning limiting the radiated EMI can only be complied with by operating the test system inside a Faraday cage 4 5 Test execution unauthorized persons do not have access during the execution of a test If a safety contact Interlock is used as a means of access control to the test zone e g a Faraday cage then an additional contact connected in series is necessary to provide protection for parts of the EUT that are likely to be touched accidentally a WARNING The test area must be organized so that During a test the EUT together with its accessories and cables are to be considered live at all times The test system must be stopped and the EUT supply disconnected before any work can be carried out on the EUT This can be achieved simply by opening the interlock circuit The EUT is to be tested only in a protective cage or under a hood which provides protection against electric shock and all manner of other dangers pertaining to the particular EUT see User warnings Generator The user must observe safety instruction for all the instruments and associated equipment involved in the test setup Test setup configuration is to be strictly in compliance with the methods described in the relevant standard to ensure that the test is executed in a compliant manner TASEO Advanced Test Solutions for EMC 20 4 6 User warnings
93. rminal 6 1 4 Burst output This socket connects the instrument to an external burst coupling clamp for capacitive coupled burst tests on data lines or to an external coupling network Note For NSG 3040 SOW models the Burst output is inactive 6 1 5 Indicator LEDs LED indicator Function Power on Instrument system in operation Pulse Shows the occurrence of pulses or a test event High voltage active Shows that high voltage is present in the instrument EUT Power on Indicates when the EUT power supply is present at the EUT connector on the front panel Error Indicates that a system error has occurred The LEDs switch on and off during the boot period and when errors occur TASEO Advanced Test Solutions for EMC 27 28 6 1 6 Touch screen and user interface The color 7 touch screen display controls include a wheel and 3 sensitivity keys used to 1 10 or 100 steps per wheel click The Start Stop and Pause keys are used to control the procedure All user interface function menus and sub menus are described in The stan dard user interface SUI 6 2 Rear panel Ethernet connection System interface Instrument supply E EUT power input 6 2 1 Instrument supply This input is to power the instrument NOTE Do not confuse the Mains power input with the EUT power input This input contains the fuses and the instrument ON OFF switch that the voltage shown on the mains input module cor respon
94. s than 5 less than 5 less than 5 16 Arms at 100 output 20 Arms at 80 output 23 Arms at 70 output 40 Arms at 40 output Friont panel rotary switch Front panel switch with on indicator 16 A Slow blow Harting tyoe HAN3A Selectable 100 110 V 220 240 V 15 VA 150 x 180 x 360 mm 12 kg approx 2 meter NSG 3000 standard cable to be used Installation connection to NSG 3000 series The equipment should be switched off during installation and inter connection 1 Connect INA 6501 EUT power out to NSG 3040 EUT power input 2 Connect INA 6501 EUT power in to mains using EUT power in cable delivered with NSG 3040 NSG 3040 EMC test system Because of the capacitors in the internal coupler gt of NSG 3040 earth leakage currents of up to 115 4 A can occur in the EUT power supply network The test system must therefore be correctly earthed and be powered from a supply that is not protected by a residual current detector RCD 3 Switch on EUT power on INA 6501 red switch when power for the EUT is required 4 Switch on the NSG 3040 5 Select the required variable voltage using rotary switch on the INA 6501 Operation The NSG 3040 operation software does not know that an external transformer external transformer Dips and Drops test EEEn TEENA Phase A 0 synch WEE 10 ms we Pas Lat a is connected The user interface software in the dips and interrupts test wi
95. s4nq4 0000001 000001 O000L OOL CT TooToo m 10 0 s o s o ro szo szo L sso Ss Q9Q _ s os oe S wn Sg OL 5 SS 2 sg SOL SOL ool soz soz OOOL d3aul OOOOL TAHSEO Advanced Test Solutions for EMC t oos lt M ol ZH 3s4nq4 0000001 000001 0000L OOOL OOL _ a L0 0 1 f LO sro Z 0 s r o L sz o ko ss 0 4 S SG L S o oa SL a sz 1 SZ 2 L ss OOL SS SOL soz OOOL soz DDRS DN OO00L dul L _ I 000001 66 NSG 3040 EMC test system 8 4 Combination wave Surge parameter setting The surge test generates high voltage pulses as specified in the international standards EN IEC 61000 4 5 8 4 1 Test configuration for power line coupling Test pulses are injected directly into the EUT power supply lines as they pass through the mains CDN s The EUT obtains its power from the EUT power outlet on the front panel of the CDN where the mains voltage has the interference signal superimposed on it 8 4 2 Test configuration for external coupling In this mode the interference pulses are switched to the surge Hi and Lo output sockets on the front panel to which an external data line signal coupler can be connected By using such an external signal coupler it is p
96. t Follow instructions of EFT burst generator user manual Mechanical parameters CDN 3425 Parameter Value Length 1100 mm Width 200 mm Height 110 mm Weight 7 5 kg approx TASEO Advanced Test Solutions for EMC 138 Mechanical parameters INA 3825 Parameter Value Length 1230 mm Width 250 mm Height 170 mm Weight 3 5 kg approx Electrical parameters of the clamp Max permissible burst voltage 8 kV Parameter Value Usable length of the clamp 1100 mm Diameter of the test cable 4to 40 mm Connectors SHV NIM female 50 Q on both ends Distance of the earth reference plane 100 mm When used together with a burst EFT generator for more than 4 kv it is recom mended to cover the CDN 3425 with the INA 3825 cover with interlock and to connect the foreseen interlock cable of INA 3825 to the interlock input of the EFT burst generator This way the user is protected from touching the CDN 3425 coupling plate when EFT burst pulses are applied CDN 3425 with INA 3825 protection cover NSG 3040 EMC test system 14 6 2 Surge CDN for unsymmetric datalines CDN 117 Teseq s CDN 117 coupling decoupling network enables convenient testing with surge pulses of 1 2 50 us on data signal or peripheral lines as specified in many product standards The test method severity levels permissible reaction of the EUT and specification of the coupling networks are included in IEC EN 61000 4 5 All coupling methods described in IE
97. t ground connections are necessary one for the test system and one for the EUT These must be connected back to the local permanent nstallation or to a fixed permanent ground conductor Operate the equipment only in dry surroundings Any condensation that occurs must be allowed to evaporate before putting the equipment into operation Do not exceed the permissible ambient temperature or humidity levels Use only officially approved connectors and accessory items Ensure that a reliable return path for the interference current is provided between the EUT and the generator The ground reference plane and the ground connections to the instruments as described in the relevant test standards serve this purpose well TASEO Advanced Test Solutions for EMC 17 The test system may only be opened by a qualified specialist upon specific instruction given by the manufacturer Since the instrument works on prin ciple with two independent power supplies one for the generator and one for the EUT the NSG 3040 must be disconnected from both sources before any modifications to the test setup are undertaken Besides the mains connections themselves certain components also operate at high voltages and are not provided with any form of extra protection against accidental contact 4 3 Installation of an EUT power switch The EUT input should be connected through a properly rated power switch device which should be located close to the test se
98. t to Synch the user must also set the phase value To set the phase value touch the phase value button A red frame is displayed around the field The phase value may be entered using the wheel or the keypad The value is in degree units and may range from 0 to 359 8 3 7 Coupling Touch the Coupling mode button IEC COUPLING in the example to select BURST OUTPUT MANUAL CDN ANSI COUPLING or IEC COUPLING Burst output Burst Output must be selected if an external capacitive coupling clamp e g CDN 3425 is connected to the NSG 3040 Manual CDN The factory setting for manual CDN is the same as for burst output IEC coupling Touch the coupling line selection field L1 N PE in the example to display the coupling selection window Touch the individual high output coupling line buttons L N and PE in the example to select an open or closed relay The Low output field Ref ground in the example is always fixed Touch OK to enable the coupling selection and close the window Touch Cancel to close the window without saving the coupling selection Touch Show Graphics to display a graphical example of the coupling selection NSG 3040 EMC test system a i i ee ow Go Coupling selection window Note Burst coupling is always to HF reference ground 8 3 8 Burst time Touch the burst time button 15 in the example to set the burst time A red frame is displayed around the f
99. ted parameter is ready for change The value can be modified either with the red wheel or using the keypad Touching th e Synch Asynch button it will change repetitively In synch mode the angle can be modified either with the red wheel or using the keypad Synch mode is only available along with a automated CDN and if the EUT power AC is sw 8 5 5 Repetition time itched on Touching the Repetition Time field it will come up with a red frame to indicate the selected parameter being ready for change The value can be modified either with the red wheel or by using the keypad Touching the units repetitively will change from s min cycle ps to ms 8 5 6 T Event Touching the T Event field it will come up with a red frame to indicate the selected parameter being ready for change The value can be modified either with the red wheel or using the keypad 8 5 7 Test duration Touching the Test Duration field it will come u the se either with the red wheel or using the keypad Touching the units repetitively will change from ms s cycle 14g cycle or ps p with a red frame to indicate ected parameter being ready for change The value can be modified Touching the units repetitively will change from Pulse Continuous s to min NSG 3040 EMC test system 8 5 8 Dips amp interrupts technical data 75 Parameter Dips amp Interrupts Uvar with optional variac Uvar step tr
100. th mains frequency Mains frequency magnetic field tests or POWERM tests involve the simulation of the magnetic fields typically generated by the current flow in power supply cables as specified in IEC EN 61000 4 8 Such magnetic fields can affect the operation of items of equipment that are sensitive to them The NSG 3040 performs this test by causing a heavy current to flow in a magnetic field coil such that the current and frequency produce a proportional field within the coil parameters The magnetic field coils available as accessories are connected to the mag netic field option MFO which in turn is connected to the system 3 5 Pulsed magnetic fields Tests with pulsed magnetic fields or PULSEM tests simulate the type of inter ference produced by surge pulses as a result of lightning strikes to buildings and other metallic structures such as freestanding masts ground conductors grounding networks etc as specified in IEC EN 61000 4 9 Magnetic fields of this type can upset the operation of installations that find themselves within such fields The NSG 3040 performs this test by causing a heavy current to flow in a magnetic field coil such that the amplitude of the pulse current produces a proportional field within the coil parameters The magnetic field coils available as accessories are connected to the surge pulse output socket via an INA 752 pulse shaping network 3 6 Slow Damped Oscillatory Wave NSG 3040 SOW only The
101. the EUT switched off Internal disruption of the electronics can result in the interference voltage or the EUT supply voltage being present on the EUT s outer casing E Electrical breakdown or arcing from connections that are overstressed voltagewise during the test E Explosion of components with fire or fragmentation as a result of energy dissipated e g from the resul tant supply current or ignition of vaporized plastic materials m Faulty behaviour by the EUT e g a robot arm strikes out or a temperature controller fails etc The user is responsible to control the rating and the integrity of all cables connected to the NSG 3040 generator especially cables connected to the Surge SOW output Burst output or EUT Power output TASEO Advanced Test Solutions for EMC 21 22 5 FIRST STEPS E This chapter contains a short checklist with steps that should be taken before the instrument is switched on and put into operation Check the packaging for signs of damage in transit Any damage should be reported immediately to the transportation company Lift the NSG 3040 test system out of its packaging by grasping of the mounted grips ing should be retained in the event that the instrument or any of its accessories should need to be returned to a Teseq service center for repair or calibration NOTE Do not dispose of packaging materials All packag Using the following list check that all the items ordered have been del
102. the conductive shell of the Sub D plug Good EMC engineering practises should be applied 9 1 Interlock Between Pin 5 hi and Pin 2 8 15 20 low This connection is an integral part of the interlock safety circuit If a number of units are incorporated in a system then these connections can be daisy chained together to form a single safety circuit If no external interlock circuit is required then the shorting connection must be made by using the terminator connector supplied Otherwise pulse generation in the system will be inhibited A built in circuit breaker enables the EUT power supply also to be switched off while the interlock function only blocks the generation of pulses or any other ongoing test resp The interlock is a safety function to ensures the following E The interlock forms a bus to which all instruments in a system are con nected NSG 3040 EMC test system E The interlock feature can be connected to external safety devices door contacts test enclosure hoods etc E f any part of the interlock circuit is interrupted all the generator modules are inhibited from producing or switching high voltages Additionally the power supply to the EUT can be switched off too B Activation of this safety feature is reported to the master controller The master controller is also notified when the interlock facility is reset Once the interruption is over and the re instatement of the interlock has been
103. tion of fast transients into signal and data lines as specified in basic standard IEC 61000 4 4 The EFT bursts coupling clamp CDN 3425 is to be used with a IEC 61000 4 4 compliant EFT burst generator The IEC EN 61000 4 4 standard also permits the capacitive coupling method to be used for pulse injection into AC and DC power supply cables when no suitable decoupling network is present The coupling capacitance between the coupling clamp and the cable laid in it depends on the type of cable its diameter and various other factors such as screening etc The option INA 3825 Safety cover with Interlock is available which avoids the user to touch the conductive plate of the CDN 3425 while EFT burst pulses get applied Preparation for operation The test rig is to be constructed in accordance with IEC EN 61000 4 4 with special reference to Operation preferably in a screened room to protect the environment Distances to the EUT and peripherals to be as specified in the standard Good and large area contact to the earth plane Tests on uninsulated cables is not permissible NSG 3040 EMC test system Operation 137 Connect the delivered HV pulse cable to the pulse output of the used EFT burst generator If INA 3825 accessory is used connect the Interlock cable to the interlock input of your generator use the INA 3825 to cover the CDN 3425 the way the interlock switch rear side middle gets activated Start the EFT burst tes
104. tivated during a test run the test is halted exactly the same as the pause function in the control software The test will continue to run as soon as the input is made inactive again If the input is already active before a test is implemented then the test cannot Start 9 5 EUT fail input Between pin 6 hi and pin 2 8 15 20 low Input open inactive input shorted active This connection serves as a control input that can be activated externally The EUT can activate this input if it is capable of reporting a disturbance effect caused during an EMC test Such events are time date stamped by the system and are stored together with the current test parameters for subsequent use in atest report if required 9 6 EUT power off Between pin 4 hi and pin 2 8 15 20 low Input open Inactive EUT power is controolled via front panel or WIN 3000 software Input shorted Active in case EUT power is switched on shorting this input will set EUT power to off Notes 1 Using this function only makes sense if an EUT power contactor is availbale somewhere in the system EUT power contactors are available in VAR 3005 INA 6502 CDN 3061 CDN 3043 CDN 3063 NSG 3040 EMC test system 2 First the EUT power has to be switched ON via front panel or WIN 3000 89 software This way allows dual drive as the EUT power can then be switched OFF either from software control or from this external drive 3 This signal is also used to drive
105. tly the interference can be coupled directly into the equipment via the mains supply The interference is conveyed directly from the source e g lightning strike to external power cables Every item of equipment connected to this power source will be affected by the interference pulses Alternatively the pulses from the source of the interference or its associated mains cables can be coupled into other equipment positioned nearby Surge pulse interference can also occur on signal and data lines through cou pling effects and electrical discharges The system enables tests to be carried out using both coupling methods The EUT is connected to the mains power socket on the front panel of the test system for direct mains injection tests Externally coupled tests require the interference to be superimposed onto signal data line cables via an external coupling unit that is connected to the surge output on the front panel of the system 3 3 Mains quality test The mains quality test includes the simulation of dips and interrupts of the mains power supply in accordance with IEC EN 61000 4 11 and for DC power supplies in accordance with IEC EN 61000 4 29 A voltage dip occurs when the supply voltage falls considerably below the TASEO Advanced Test Solutions for EMC nominal level for a relatively short time e g for a few cycles whereas an inter rupt means that the voltage falls to zero for a similar period 3 4 Magnetic fields wi
106. to address the requirements of new standards and new function units for new parameters may be incorporated in existing systems The NSG 3040 is controlled through its standard user interface via a touch panel display The system can also be controlled by a remote PC via its Ethernet interface NSG 3040 EMC test system To ensure optimal user and equipment safety only industry standard and 11 correctly specified plugs and sockets are used throughout TASEO Advanced Test Solutions for EMC 12 3 STANDARDS AND APPLICATIONS Ml The NSG 3040 test system is designed primarily for cable borne transient inter ference tests as specified in the European generic standards IEC EN 61000 6 1 covering equipment for household office and light industrial use and IEC EN 61000 6 2 for applications in industrial environments The NSG 3040 generates these tests in accordance with IEC EN 61000 4 4 4 5 4 11 4 18 and 4 29 depending of the model Accessories are available for generating optional tests to IEC EN 61000 4 8 and 9 The EU directive No 2004 108 EC for the assignment of the CE symbol refers to these standards and to this type of equipment 3 1 Burst test Burst tests in compliance with IEC EN 61000 4 4 simulate the high voltage high frequency interference pulses typically produced when an inductively loaded switch is operated Without countermeasures such interference may occur when a current through an electromagnetic dev
107. to both of these standards but includes a wide range of over testing capabilities like higher pulse voltage higher pulse repetition rates and a selectable source impedance for tests closer to reality conditions NSG 3040 EMC test system 8 8 1 Slow Damped Oscillatory Wave parameters window 79 Slow Oscillatory Wave test Surge TE Output Osc Frequency 1 MHz A Alt 200 V Burst Frequency 400 s Burst Duration 2s Impedance 2000 Repetition Time 4 Test Phase a Asynch Duration 1201 8 Reo E h lin cm Slow Damped Oscillatory Wave test window Parameter Value Coupling Surge output Manual CDN EUT Power Output Pulse voltage 200 to 4 400 V in 1 V steps Polarity positive negative alternate Oscillation frequency 100 kHz 1 MHZ Burst frequency repetition rate 100 kHz 1 s to 120 s default 40 s 1 MHz 1 s to 600 s default 400 s Output impedance 2000 1500 Burst duration Si Ioa 100 pulse 1 9 999 Continous Repetition time ms 2 99999 Si 1200 Test duration S 1 991999 O00000 h 1 11000 Continous Phase synchronization asynchronous synchronous 0 to 359 in 1 steps 1 Burst frequency repetition rate and Burst duration Repetition time are derated for voltage levels above 3 3 kV TASEO Advanced Test Solutions for EMC 80 100 10S Oscillatory Wave 100KHz 7 n8 1 Burst frequency 1 Repetition rate Burst duration Repetition time
108. tor RCD Because of the capacitors in the internal coupler of NSG 1 Switch on the VAR 3005 first 2 Switch on the NSG 3040 3 Switch on the EUT power red switch if power for the EUT is required HW Detection The VAR 3005 is automatically detected by the NSG 3040 during the booting process Its presence is visualised in the system settings screen TASEO Advanced Test Solutions for EMC 110 Equipment details CWM 3450 0002 11 22 2 2009 13 2 2009 FTM 3425 0002 11 73 19 11 2010 19 11 2010 YAR 3005 0002 11 1 15 9 2010 18 9 2010 Once a variac detected the function for voltage variations gets active See functionality of variation tests below UARA VOLTAGE t VARIATION Operation In case of a VAR 3005 D16 the Uin field in the window System General set tings appears Here Uin EUT supply voltage can be set to any supply voltage within the specified range General settings Voltage Beeper volume Uin 230 v EUT OFF Interlock action Expert mode al vg a Dips and interrupts testing The parameter Field Voltage Uvar gets active once a VAR 3005 has been detected by the software NSG 3040 EMC test system Uvar can be selected for one of the four available variable voltage levels O 111 40 70 80 Dips and Drops test Ye a nn Phase n Aaye T Event 10 ms s j Repetition Test basina Time ___ of Duration o afp E 0 ae Voltage variations testing Voltage var
109. tup In order to ensure easy and quick access to the EUT power the switch should be clearly and visibly labeled as EUT power ON OFF The in house power distribution must be equipped with a proper circuit breaker and an emergency off button as per IEC 61010 1 2001 The test setup should only be accessible to trained per i sonnel Dimensioning of the mains supply and rating of fuse protection of the AC or DC power supply must conform with local electrical codes and EUT requirements Inappropriate arrangement mounting cabling or handling of the EUT or ground can hamper or negate the effectiveness of the NSG 3040 s safety features 4 4 Applicable safety standards Development and manufacture is in compliance with ISO 9001 The system complies with the safety requirements of IEC EN 61010 1 Safety requirements for electrical equipment for measurement control and laboratory use It is the user s responsibility to ensure that the test rig does not emit excessive electromagnetic interference EMI that might affect other equipment The test NSG 3040 EMC test system system itself does not produce any excessive radiation however the injection of interference pulses into the EUT can result in the device and or its associated cables radiating EMI To avoid radiating unwanted interference the standards organzations recommend that the test setup be located in a Faraday cage Since the purpose of the test system is to produce inte
110. uarters Teseq AG 4542 Luterbach Switzerland T 41 32 681 40 40 F 41 32 681 40 48 sales teseq com www teseq com China Teseq Company Limited T 86 10 8460 8080 F 86 10 8460 8078 chinasales teseg com Germany Teseq GmbH T 49 30 5659 8835 F 49 30 5659 8834 desales teseq com Singapore Teseq Pte Ltd T 65 6846 2488 F 65 6841 4282 singaporesales teseg com Taiwan Teseq Ltd T 886 2 2917 8080 F 886 2 2917 2626 taiwansales teseq com USA Teseq Inc T 1 732 417 0501 F 1 732 417 0511 Toll free 1 888 417 0501 usasales teseq com To find your local partner within Teseq s global network please go to www teseq com Manufacturer Teseq AG 4542 Luterbach Switzerland T 41 32 681 40 40 F 41 32 681 40 48 sales teseq com France Teseq Sarl T 33 139 47 42 21 F 33 13947 4092 francesales teseq com Japan Teseq K K T 81 3 5725 9460 F 81 3 5725 9461 japans ales teseq com Switzerland Teseq AG T 41 32 681 40 50 F 41 32 681 40 48 sales teseq com UK Teseq Ltd T 44 845 074 0660 F 44 845 074 0656 uksales teseq com December 2013 Teseq Specifi cations subject to change without notice Teseq is an ISO registered company Its products are design ed and manufactured under the strict quality and environmental requirements of the ISO 9001 This document has been carefully checked However Teseq
111. under the name entered All letters and numbers as well as hyphens spaces and dots can be used in file names The maximum file name is 40 characters including spaces The system automatically generates a file extension to identify the type of test For example all burst tests will are given the extension EFT Touch the Cancel button to return to the test parameter window without saving the file 8 2 4 KEYPAD Touch the Keypad button to display a numeric keypad The Keypad button is active only when the user has selected a parameter that requires a numeric entry Touch individual numbers to enter them touch C to clear an entry and touch Enter to enter the value in the field After touching Enter the keypad will close Keypad NSG 3040 EMC test system 8 2 5 SHOW GRAPHICS Touch the Show Graphics button to display waveforms coupling diagrams and other graphical information for the selected test Touch the More button to view additional information Touch the Back button to view previous graphics Touch the Exit button to return to the Test parameters window Burst pulse coupling ANSI IEC ANSUIEC Example burst pulse graphs 8 3 Burst parameter setting The generation of high voltage bursts and high frequency pulses is part of the EFT burst package test required in the international standard EN IEC 61000 4 4 The test NSG 3040 generates bursts of i
112. uring 1 x 1m and are suitable for test objects with dimensions up to 0 6 x 0 6 X0 5 m IX wx h Three types of loop can be supplied INA 701 The INA 701 is a 1X 1m loop single turn with a coil factor of 0 89 It enables the generation of field strengths of up to 3 6 A m for mains frequency fields 50 or 60 Hz when used with the MFO 6501 or MFO 6502 current sources and 1200 A m for pulsed magnetic fields where the current is generated by a 4400 V surge generator NSG 3040 EMC test system INA 702 The INA 702 is a 1 x 1m loop 11 turns coil factor 9 8 when fitted with the power plug It enables the generation of field strengths of up to 40 A m for mains frequency fields 50 or 60 Hz when used with the MFO 6501 or MFO 6502 current sources INA 702 becomes a single turn loop when fitted with the pulse plug which allows the generation of pulsed field strengths up to 1200 A m where the current is generated by a 4400 V surge generator INA 703 The INA 703 was conceived for tests at stronger power frequency magnetic fields according to IEC 61000 4 8 A multi turn concept 37 turns allows the INA 703 to generate fields higher than 1000 A m while using a programmable AC source rated for just 30 A This enables testing to the IEC 61000 4 8 standards requirement of a current THD lt 8 which can be met only with a programmable AC source The INA 703 has taps at turns 1 and 5 providing increased accuracy when generating lo
113. utions for EMC 71 72 Coupling EC external manual Pulse repetition 10 600 s in 1 sec steps 1 10 min Test duration 1 to 9999 pulses Continuous Repetition rate depends on voltage 200 to 4400V 10S repetition time 4401 to 6600V 20 s repetition time 8 5 Dips interrupts and variations Dips interrupts and variatons tests are in line with the specifications of IEC 61000 4 11 The EUT suppy voltage Input La gets switched off shortly via a semiconductor switch in order to generate short supply interrupts Asecond switch is available in the generator with a second input channel Input Lb where a variable supply can be connected This second switch works in opposition with the first one so always one of the 2 switches is closed when the other one is open Generally a step transformer or a variac is used as second supply powered by the same supply than Input La in order to have phase synchronisation of the 2 input sources This setup allows dips which are short voltage variations from one supply voltage level provided through generator Input La to another voltage level provided through generator Input Lb EUTs with universal supply voltage ranges ex 85 to 245 VAC need to be tested for both extremes of supply For this application Teseq offers a double variac VAR 3005 D16 which allows to provide the variable voltage required for EUT powering as well as the variable voltage of the dip th
114. vironments Pro fessional quality connectors ensure user safety additional system protection is provided by a temperature sensor located on the heatsink of the power amplifier E Connecting capacitive loads will destroy the Instrument MFO 6501 is designed to drive INDUCTIVE LOADS ONLY as magnetic field loops Circuit diagram MFO 6501 Mains Power supply ie input 15V 0V 15V Black Power amplifier LL O Signal generator VY S 50 Hz Amplitude Low 60 Hz setting High NSG 3040 EMC test system Technical specifications MFO 6501 127 Parameter Value Total harmonic distortion THD lt 8 nominal lt 3 5 at full range Frequency Selectable 50 and 60 Hz 3 Range low 80 to 400 mA into INA 702 Cf 9 8 gt allows 0 8 to 4 A m 80 to 440 mA into INA 701 Cf 0 89 gt allows 0 08 to 0 4 A m INTO INA 703 Range high 200 mA to 4 1 A into INA 702 Cf 9 8 gt allows 2 40 A m 200 mA to 4 1 A Into INA 701 Cf 0 89 gt allows 0 2 3 6 A m Supply voltage 90 to 240 V Power consumption lt 150 W Operating temperature 5 40 C Overload protection By temperature sensor on power stage Weight 4 kg approx Dimensions 195 x 180 x 380 mm Typical for the full range from standard level 1 lowest standard level to full range level X Current adjustment through customer provided amp meter Installation The equipment should be switched off
115. vironments Profes sional quality connectors ensure user safety additional system protection is provided by a 16 A fuse located in the top panel Thanks to the provision of an 80 voltage position and to the large over current capabilities the step transformer is fully compliant with the latest requirements called for in IEC 61000 4 11 2004 standard mechanisms it is strongly recommended to power on first the INA 6502 accessory and then the NSG 3040 Powering on the NSG 3040 main frame before the acces sories may result in non detection of accessories For proper operation of the plug and play detection Operation The parameter field voltage Uvar gets active once an INA 6502 has been detected by the software The entry of Uin is by default 230 V and may be set to other voltages this can be done in the system general windows Uvar can be selected for one of the 4 available variable voltage levels 0 40 70 80 Circuit diagram INA 6502 EUT Power ON OFF Circuit Breaker Option CIB L ae Uin Eae ea ae E 16A e Uvar cur NC s H p Poer gE A T H i FE w n a a Power N o ari n OUT 0 10 70 80 EUT Power isir ON OFF i Power X Supply J Supply Interface Controller 3 Remote Test EUT Plug XI System cable IN Plug X2 System cable OUT Power OFF 25 Way Sub D Male 25 Way Sub D Female Connection to NSG Termination with
116. w amplitude fields For testing to IEC 61000 4 8 the INA 703 can be used as an accessory to a TESEQ Profline system comprising an NSG 1007 source an INA 2141 impedance box and the the WIN 2120 software TASEO Advanced Test Solutions for EMC 123 124 The INA 703 can also be used with the MFO 6501 or 6502 current sources and the NSG 3000 series of generators to generate supply frequency fields 50 Hz and 60 Hz over 120 A m continuously With its multi turn concept and professional mechanical design features such as the U shaped caster base for convenient positioning at the test table the INA 703 is the ideal accessory for magnetic field testing In order to meet the pulse waveform required by IEC 61000 4 9 the waveshape adapter INA 752 needs to be used with NSG 3040 and the INA 701 and INA 702 loop antennas The tests are carried out using the so called immersion method i e the item under test is placed in the center of the loop The test is performed in accor dance with the IEC 61000 4 8 mains frequency or IEC 61000 4 9 pulsed standards for magnetic fields NSG 3040 EMC test system 14 4 1 Manual solution MFO 6501 125 The manually operated current generator type MFO 6501 magnetic field option is a standard accessory for the Teseq NSG 3040 series It provides a convenient means for generating and adjusting the current to flow through one of the magnetic field loops INA 701 or INA 702 It is required for magnetic
117. ynco A E E through the zero crossing ore point with rising signal level Puts the NSG 3060 intoan 5 sync1 Interlock idle state The Error LED bastante raed ights in this state EUT reports a fault to the z 6 sync2 EUT fail NSG 3060 software The ah areata to master est is stopped External device receives Tozfrom the active 18 Sync3 Teger to he Trigger to Scope signal eee oscilloscope rom the generator slave controller and master controller From external device 17 sync4 Pulse enable ee device stops the o the slave and master controllers 4 syncs EUT power OFF Connecting this PIN to From external device GND24S will force the EUT o the slave and power to OFF master controllers Note First EUT power needs to be switched ON via the instrument front panel or WIN 3000 Software This allows dual drive as then the EUT power can be switched OFF and ON either from software control or from this external signal drive TASEO Advanced Test Solutions for E mc 32 Pin Sync line Signal Remark Working direction i Output is High when HVis Output to drive INA ka Synce High voltage ON active 3001 warning lamps Internal usage 3 sync7 Reserved debug mode 2 8 15 20 GND Sync bus ground return 1 24V Interbus 24 V suppl 14 21 dai 19 Interlock return Interlock return line All Interbus lines others See chapter System interface connector functions for mo

User Manual: Teseq NSG 3040 4kV Conducted

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