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QST External Tests User`s Manual - us

1. Sweep Cycles E From deg f 90 Multiple Curves E Angle Transfer 1 112 2 06 07 PM Bias 0 Averages 10 To deg 30 Reverse Backup j dE Field De 300 Inc deg 5 Show uv Forward Reverse 1 00 Figure 23 1 Angle Transfer Test This test is multi setup capable which means that user can create more than one setup of this test in one MDS file Angle Transfer also does not clear results automatically which allows user to see different runs superimposed on the plot User can select multiple curves option to see curve from each cycle or disable to see the average curve There is an option to display uV ohms or resistance percent change Note that this will only affect the raw data and the plot while the amplitude also Min Max Hysteresis will still be in uV When sweeping angle in reverse the test has ability to go back through the same angles just in the opposite order or to sweep in the offset quadrant See the Reverse option for more details Unlike traditional transfer curve where the amplitude is symmetrical around 0 oe field in this test the amplitude appears anywhere However the value at 0 degree angle will correlate to the traditional transfer curve ran to the same field magnitude For example Amp Q 3000e transverse test will be the same as angle transfer Amp Odeg 3000e magnitude There is preconditioning and stress options Preconditioning will apply once before the test and
2. cles Test Tira Tima Glas MEA M AREA Mete FSM NE TA E Dele ines O Ww in E EL m o 13 5125 19 5025 CMeter Capacitance Measurement IA 11 02 15 AM Figure 24 2 CMeter Test Example Page 66 Integral Solutions Int l October 5 2011 24 4 CMeter Calibration CMeterApp Application adds an eeprom to the Quasi97 gt Diagnostics menu The EEPROM non volatile memory stores all the calibration factors associated with resistance and capacitance measurement The eeprom 1s physically located on the cap analyzer board Diagnostics Print Preview Print Splash Screen Features Board Diagnostics Name Wite Read Board SN 59002 59002 1856 1856 384 384 524 524 3 Write Preamp F 24 3 CMeter EEPROM The calibration of the capacitance analyzer module is done at the factory and does not need recalibration The eeprom values are used in the following manner Capacitance Measured Value Cap Gain Cap Offs Resistance Measured Value Res Gain Res Offs Cable Capacitance Zeroing A tooling connected to universal interface motherboard will introduce different capacitance offsets For example HSA tooling when connected may add 20pF offset on CH1 and 30pF on CH2 while an HGA tooling may introduce 300pF offset on CHO To deal with these offsets the software has cable offset zeroing feature The cable capacitance zeroi
3. Time Init Threshold Cydel Cycle 2 Cycle 3 j ydeN Figure 6 1 SMAN Test Diagram SMAN has 3 basic results which are MaxNoiseAmp NoiseAmp and NoiseRMS AII these results come from Digitizing 250uS worth of data at each Field At the end of the test software plots all 3 of these calculations performed at every Field value For the 250uS of data at each field this is not read in one large chunk but actually is captured over several cycles Each cycle size is defined by your READ length For example if you set READ length to 5uS you will see the number of Cycles automatically change to 50 Once the 250uS of data is read in the calculations are performed as follows First the MaxNoiseAmp is just the singlemost highest noise spike read from this data Second the NoiseRMS will be calculated using all 250uS worth of data For NoiseAmp calculation we will find the highest noise spike in each cycle Then add up all of the highest noise spikes and divide by the number of cycles ie get the average of the highest noise spikes This result gives you a combination of noise amplitude and probability If there 1s a very high noise spike but all the others are low then MaxNoiseAmp will be high but the averaged NoiseAmp will be low Alternately if there is a lot of noise but none of these spikes are terribly high then the NoiseAmp will be higher and be very close to the MaxNoiseAmp At each field if enabled the
4. Determines how the statistical results are generated in this test See the algorithm details above for more detailed description After updating any one of the parameters the Register Results button becomes available This command builds a list of result names and notifies Quasi97 along with the rest of the tests that these new results are available The tests table allows user to select tests to run as part of SR sweep The tests are executed top to bottom as they appear in the tests table Each test has an optional prefix parameter which will be applied to every result imported from 1t It also has individual enable checkbox Test Enable Prefix The test ID and user label The software will keep track 1f user deletes the test or changes the label and update it on this table Turns the test on or off inside the SR sweep The result names imported from the selected test will be appended in front by this setting For example the test is transverse and the prefix is T T Resistance ohm Avg T PkPk Amplitude uV Min The results grid shows all possible results and statistics from the test selected on the test grid The results are always sorted by name for faster processing when running the test Result Avg Max Min Range Std COV COD Missing Remove Missing Results The name of the result To extract any statistic simply click on the checkbox in the appropriate column Only the statistics s
5. 10 AC Spectrum Test SpectrumApp Application AC Spectrum test allows spectrum analysis of the head amplitude through 200Mhz AC Channel available on testers with Popcorn Option To run the test enable SpectrumApp Application in Add Ins gt Selected Modules AC Spectrum test digitizes head Rdx Rdy output and then uses Fast Fourier Transforms to plot head amplitude Db as a function of frequency Mhz Results include RMS uV Peak Amplitude Db and Peak Amp Frequency Mhz 10 1 Expected Utilization Engineer can set magnetic field and write during the test to analyze writer to reader coupling and magnetic field effects on head s baseline noise 10 2 Setup Parameters Filter One of the two available filters to be used during the test RBW Read Bandwidth 5 625Khz Scale Linear AuV Logarithmic dB 20Log luV AuV Logarithmic with fixed reference dBm 20Log J75uV Unit The units for the results are selected here The raw data in AC Spectrum test will be in these units Then you can find out the range Max Min by enabling different statistics from Tools menu uV rms amplitude rms micro volt at each frequency uV Peak amplitude maximum micro volt at each frequency uV rms power rms uV peak power uV ms amplitude rms spectral density E amplitude peak spectral density 4 Hz 2 UV ms Hz power rms spectral density 2 uV power
6. Min dH The maximum delta between F H and R H on the sweep range The location of the maximum difference between F H and R H The maximum difference of ACH and A H Inc where A is the continuous transfer function In other word the maximum jump in amplitude that occurred on forward or reverse sweep Barkh Jump Bi PkPk The location of the Barkh Jump PkPk Ohm 100 C vs Where Rois the amplitude measured at center field PkPk Ohm 100 Where R 18 the minimum resistance measured min Max Mi Average amplitude that 1s used to calculate Hc AA H cr H CR 2 Where H r is the field where mean amp is reached on the forward sweep and H r is the field where mean amp is reached on the reverse sweep Page 93 Integral Solutions Int l October 5 2011 Hc Oe Abs H r Her 2 Where Hc is the field where mean amp is reached on the forward sweep and H r is the field where mean amp is reached on the reverse sweep Note that software automatically adds several User Results that start with the prefix Fine These are the result measured inside the Fine Sweep range See User results for more detailed info on those 30 3 User Results User can add custom results to process the transfer function raw data Click Results Definition and add items to the user results table The following list contains custom functions available with the transfer curve test and the result
7. Noise RMS uV Noise in uV Root Mean Square value calculated from digitized data from all read times Noise Amp uV Average of the maximum noise amplitude seen in each cycle Max Noise Amp uV Highest of the maximum noise amplitude seen in each cycle Noise RMS Max Field Field that produces the highest Noise RMS value Oe Noise Amp Max Field Field that produces the highest Noise Amp value Oe Max Noise Amp Max Field that produces the highest Max Noise Amp value Field Oe 6 4 Example of Result and Printout Spectral Maximum Amplitude Noise Test Grade Cycles Test Time Tes Dae Time Trato OperatorID Tester BE E r Hd IP FarssA N A 25 9 166 S M A N Test 9 17 200 12 02 11 Bar 1 y Cycles 25 v Do Not Write v Bias On During Write p x Write uS 50 Delay uS 2 Read uS j 0 Spectral Maximum Amplitude Nolse Plot Write Current m 35 Frequency Mhz 100 PartID 18 Head SR 41 MEM M From Field De 1 50 To Field De 150 Inc Field De 5 Noise EN Noise Ri RMS M m Noise EN Enable Initial Thr Initial Thr UV d ira E I E TN Noise Amp y V 3 95 i 13 246 0 283 i 60 065 23 331 Noise Amp Max Field D 40 Max Noise Amp Max Fiel 60 Noise RMS Max Field D 70 m 100 15 1 0e F atent F ending Clear Results Plot Reset Plot Scales Show All Curves Figure 6 2 Soft Kink S M A N Test Page 17
8. Figure 3 1 AC Noise Page 11 Integral Solutions Int l October 5 2011 4 Noise Sweep Test NoiseApp Application The Noise Sweep test reruns selected Noise test while changing its parameter s The test calculates and displays statistics as a function of changed parameters 4 1 Expected Utilization The Noise Sweep test is used to discover GMR read instabilities that occur only under certain circumstances Examples of this would be DC Noise shifts and AC Noise instabilities that occur only at certain bias currents 4 2 Setup Parameters Noise Test Test that will be swept Statistic Statistic that will be extracted from the Noise Test data Most commonly Avg or Max Sweep Parameters Parameters to be swept Parameters can be swept as Max Min Inc or as discrete values separated by semicolons 4 3 Results Results are based on the test selected 4 4 Example of Result and Printout JA Noise SweepTest Hd Grade Cycles Test Time fTest___ Date Time ParID_ Operat E HdO Passec 1 3081 Sweep Parameters Parameter Enable From To Inc Discrete Values Enable Discrete Read Bias m v 2 4 Noise Sweep Test Field De Par ID Pal Head Hd Q Noise Statistic AVG Clear Results Plot Reset Plot Scales Show All Curves Figure 4 1 Noise Sweep Page 12 Integral Solutions Int l October 5 2011 5 Maximum Amplitude Noise Test NoiseApp Application The
9. 1 e Hsat No parameters are required the fitting is done on the whole sweep HSat Forw Oe Hsat result from fitting on the forward sweep curve HSat Rev Oe Hsat result from fitting on the reverse sweep curve HSat Avg Oe Forward and Reverse sweeps are averaged The HSat AVG 1s the result from the fitting done on the average curve HSat Avg Fit The R of the HSat Avg 30 3 5 CycleRep The function CycleRep helps determine amplitude repeatability at each field This function is only available when user runs 2 or more cycles At each field step function calculates the minimum and maximum value across multiple cycles and then reports the max single point out of this new curve If one parameter is set for this function then slope will be calculated on the range Center abs P Center abs P If two parameters are set for this function then slope is calculated on the range Center P Center P gt Max Var Forw X Maximum variation at a single field on the forward sweep across several cycles MAX joco p MAX F H MINES RCD Max Var Forw at Oe Field location where Max Var Forw occurs Max Var Rev X Maximum variation at a single field on the reverse sweep across several cycles MAX CMT 2M AXEZ R H MINE RH H center t P4 Max Var Rev at Oe Field location where Max Var Rev occurs Page 95 Integral Solutions Int l October 5 2011 30 3 6 Max Slope The max slope function calculates slopes in small
10. 100230 814 DC Noise VBias ELGA Part ID 8 6 Head aROCO Result Definition SEE Du iE e YA iii fi TT TT Ti uuo duy Sample 100 200 300 400 500 600 700 800 900 1000 0 Figure 27 2 DC Noise VBias Test Example fu E E v E D e D E 7 Li ar E wu fS gt E gt u A z w a 9 20 201 11 58 14 0 295 DC Noise VBias 24 778 D 202 tor ID Tester ID Spec ID LotID Comments ES ES RR GE et Stress Options Part ID Head Hd 1 DC Noise VBias l 11 58 14 AM Result Definition 15 Time mS C 1 ar Cker yn dwy DC Noise VBias Test Example 2 Figure 27 3 Page 76 Integral Solutions Int l October 5 2011 28 DC Noise Bias MagneticSensor Application The DC Noise Bias is a complement to DC Noise Vbias test for using on low resistance devices The test uses 16 bit 2mA constant current bias source for measuring resistance Primary function of the test is to set constant current and measure voltage drop at the device in order to calculate resistance Mosemisnca O c 2 L OU O OO 10 xi Hd Grade Cycles TestTime Test_ Date Time PatlD Operator ID Tester ID Spec ID LotID Comments Device ELG A IBias uA 100 M aROCCN A 1 0 212 DCNoiselBias 8 8 201111 52 228 86 o Field D do na ield De E Samples 1024 E 1065 907 10002 530 DC N
11. Figure 13 1 Bias Angle Test AMR head Page 35 Integral Solutions Int l October 5 2011 14 Resistance Delta SweepApp Application MR Temperature can be calculated from a set of user defined parameters by measuring HGA HSA change in resistance These parameters include the wire lead resistance of the HGA HSA and the temperature constant of the MR material The Resistance Delta Measurement then sweeps Bias Current while measuring Resistance and calculating MR Temperature 14 1 Setup Parameters Cycles Averages Sweep From mA Sweep To mA Sweep Inc mA Magnetic Field Oe Resistance Trend Line 14 2 Results Coefficient A B C Number of iterations entire test will be run Number of averages per each point measured Starting bias current in m Ending bias current in m Amount to increment bias current in mA Strength of magnetic field in Oersteds Type of curve to fit onto measured data useful to find cold resistance The factors of parabolic function fit onto measured data Coefficient C is cold resistance 14 3 of Result and Printout e Fad N A que erede crees Test Time Test Date Time PatlD Operator ID Tester ID Spec ID LotID Comm Cycles 53 52 Resistance Ohm MR Temp C Clear Results Plot 4 Resistance Delta Plot Part ID Head FarHd 0 Reset Plot Scales Averages Sweep Bias From Swe
12. Gap Width 0 1 2 3 4 5 5 4 530 222 139 3 139 7 229 493 I 627 292 224 292 614 3 4 697 370 361 641 1 2 728 518 734 Note that this table approximates field values and a given gap size so calibration should be performed every time the gap size is changed 21 3 Error Messages and Faults e Active LED is ON Active LED turns on when the QMS drives current through the magnet You should not attempt disconnecting the magnet if Active LED is on e Fault LED is ON QMS has a 5Amps circuit breaker in front which protects the magnet from damage If side field is left on for a long time the circuit breaker will trip and Fault LED will turn on but user can reset it within one minute Software will report that fault and reset the field to 0 e Magnet Resistance is out of range Software will check the magnet resistance on the startup and if resistance is out of range then either the magnet is not connected or saved resistance is wrong To save resistance of the current magnet run SideField in stand alone mode and click Measure Magnet Resistance e QMS Power is OFF is displayed when the power is off e Can not set field higher than X Reduce the gap size or and recalibrate the magnet gain Page 56 Integral Solutions Int l October 5 2011 22 S8 Test S8Module Application The SS Test s purpose is to run different test sequences on different heads and then show the statistical results of those tests as its own For exam
13. Integral Solutions Int l October 5 2011 3 2 Setup Parameters Cycles Number of times to sweep magnetic field One cycle is defined as one triangular wave 100mS Filter Filter to be used for the measurement Amp Threshold uV Amplitude threshold used during the tests Pulses higher than the threshold will be counted and the total number of noise counts will be reported as a result Peak Field Oe Base to Peak amplitude of the Triangle wave field in Oe Multi Events Per Cycle If enabled all events that crossed the threshold during the cycle will be counted and result will show the total number If false each cycle will return either O for no events over the threshold or for one or more events Preconditioning Preconditioning items are executed at the start of the test and restored at the end of the test Stress Stress is performed after preconditioning at the beginning of each cycle during the test 3 3 Results Count The number of events that crossed the threshold If Multi Events Per Cycle is turned off then this will either be O or 1 3 4 Example of Result and Printout lo x qo TET eo Tester Spec Lot coment LE FaiSRIN A 11 AC Noise Test 9 17 20 11 19 29 Bar zl Cycles nh Preamp Gain po Results Data Parameters Grades Filter F1 D 30 MHz Amp Threshold uv 15 Peak Field De 100 v Multi Events Per Cycle Present Results as Log10 Pre Conditioning Stress Options
14. a0 10000 T LS340 Setup Preconditioning Results Parameters Grades 4 003 3 724 4 003 50522 0 02 50 522 9 792 81283 9 792 5 0 0 0 5 0 50 51 LI LL T A LI LI E LL LL LL I I lg I LL I LL IL LL LI lil on 26 0 26 5 27 0 27 5 28 0 28 5 29 0 29 5 30 0 Temperature C Pm bh aos Pm a Fa n 1 oe ane Figure 20 4 Temperature Control Sweep Mode TempCont Transfer Curve Iof x Amplitude uv EEN CC E E SE A 0 N A TempTransterl 1277 4 Part ID Operator ID ter ID Cycles fi N k 2 TempTransferC 12 7 Operator ID Tester ID fio B N A i 0 33 TempTransferC 12 7 98 3 08 31 PH Part ID 0 Tester ID poo TE Sweep From De 1100 TempTransferCurve Transfer Curve dicis ia Sweep To De 1100 EEE Forward Reverse Sweep Inc De 1 Measure At De 50 PPP supe su alone mi feia ini E t Write IV Symmetrical M AA EE E pr Los Results Data Paramel Grades UM DER te E A oe ERE ACC 01 a ERE 1 Bias Current m 93 93 93 0 Resistance Ohms 35 19 35 19 3519 10 1 1 1 Amb Temp C 2231 22 31 2231 O Min pV 140 99 140 99 140 99 0 50 L 24 O A E E ae E A eae E MK Max uv 110 47 110 47 110 47 10 1 Pk Pk Amp uv 1251 46 251 46 251 46 0 Pk Pk Asym 3 1214 1214 11214 O Barkh Jump pv 1343 1343 1343 O 100 L 2 A PD se S
15. and R H The maximum difference of A H and A H Inc where A is the continuous transfer function In other word the maximum jump in amplitude that occurred on forward or reverse sweep Barkh ump 1 pO PR The location of the Barkh Jump 100 PkPk Oh l l a where Rois the amplitude measured at center field 0 PkPk Ohm n 100 x a where Rmin 18 the minimum resistance measured min Page 85 Integral Solutions Int l October 5 2011 Mean Amp X Max Mi Average amplitude that is used to calculate Hc an HOffs Oe Her Her 2 Where Hc is the field where mean amp is reached on the forward sweep and H r is the field where mean amp is reached on the reverse sweep Hc Oe Abs H r Her 2 Where H r is the field where mean amp is reached on the forward sweep and H r is the field where mean amp is reached on the reverse sweep Note that software automatically adds several User Results that start with the prefix Fine These are the result measured inside the Fine Sweep range See User results for more detailed info on those 29 3 User Results User can add custom results to process the transfer function raw data Click Results Definition and add items to the user results table The following list contains custom functions available with the transfer curve test and the results that are going to be generated by these 29 3 1 Slope Performs a linear fitting of F H aH b model o
16. measured at Doe mV Volt 10 is absolute voltage on the device This 1s recalculated using current and resistance measured at Ooe field Ohm Resistance of the device at field 4PtmV True voltage across the device measured at field Use this 1f need be in the applications where Vsense probes are connected to a different set of pads from Vbias probes The test adds all three factors that may have been used to recalculate Amp Voltage mV Current uA and 2Pt Resistance Ohm These results are measured at Ooe field Test features selectable measurement range for the 14 bit ADC The smaller the range the better is the resolution Ranges 5 15 50 150 325 are using the low gain mode while 0 05 3 3 are using the high gain mode These modes may be of interest VBias 102 Low gain mode is straight forward the Range must be gt E VBias 10 2 100 Rmin For example 10Kohm device with 250mV VBias requires 25uA max current To measure this without saturating the channel user can select low gain ranges of 50 150 or 325 or high gain ranges 0 5 1 5 or 3 3 This may be counter intuitive at first as 3 3 selection work ok but 5 or 15 does not work but if the formula listed above is used there should not be any problem selecting the right range Another key factor to consider when choosing one of the high gain ranges is the current difference at Ooe and at user specified field For example if the sensor changes resistanc
17. pdt N A 2 EE Transverse Bia 3 20 201118 28 23 dll a d Cycles 2 Averages 10 Sweep De 250 Inc 5 e De Transverse IB 1a S 1 Fine Sweep Oe 100 Fine Inc 0 5 Bias Part ID Head Hd 1 Range vifio E Preconditioning Amp Units uv Stress Forward Reverse Chart Option Multiple Curves M PE E 188 5 Result Definition Figure 30 1 Transverse IBias Test 163 087 191 738 The test uses step settle and measure algorithm After setting each field the test waits until the magnetic field is settled and then takes one or several measurements Several measurements at each field are then averaged and placed into raw data table into the Amplitude column The units for the amplitude result are set by the user from several available choices The amplitude can be displayed in the following units uV Volt 10 This is relative to the voltage sensed at center field Amp AMPoriela Ampoo mV Volt 10 is absolute voltage on the device This is does not subtract voltage at center field Ohm Resistance of the device at field The test adds all three factors that may have been used to recalculate Amp Voltage mV Current uA and Resistance Ohm These results are measured at center field Test features selectable voltage measurement range for the 14 bit ADC The smaller the range the better is the resolution Ranges 100 6500 are using the low gain mode while 1 6 5 are using the high gain m
18. Example Printout Meter l Capacitar mani DOT Rp DO e pa p ap O iste Ma 10 DELE LH eb 1 ARA TT CMeter 1 Capacitance Measurement 19 5175 19 5150 19 5125 L 19 5100 i q a E m E m o 19 5075 19 5050 19 5025 1 Creio Integral Solutions Int l October 5 2011 Figure 25 2 CMeter Hd Test Example Page 70 Integral Solutions Int l October 5 2011 26 Magnetic Sensor MagneticSensor Application The response of the constant current bias source is inversely proportional to the resistance of device under test For higher resistance devices 10Kohm and above the performance of the bias source starts to cause significant artifacts in the measurements such as increased hysteresis and wrong amplitude Moreover the milliamp bias current unit and rounding in other tests become unsuitable in such application To circumvent these shortfalls ISI has developed a suite of tests optimized for extremely high resistance devices 10KOhm and above The VBias tests set constant voltage bias and sense current flowing through dut They utilize the isolation measurement circuitry on the 2xBar Gen3 interface board this is also available on 2XHGA Gen3 The voltage bias source on 2xBar Gen3 has 16 bit 5V range and features fast settling time The VBias tests are not well suited to measure low resistance devices because the upper limit for the current measurement is 330uA and because resistance of the sw
19. File 67 24 5 Hardware Diagnostics Menu 68 Page 3 Figure 25 1 CMeter Hd Test Figure 25 2 CMeter Hd Test Example Figure 27 1 DC Noise VBias Test Figure 27 2 DC Noise VBias Test Example Figure 27 3 DC Noise VBias Test Example 2 Figure 28 1 DC Noise IBias Test Figure 28 2 DC Noise IBias Test Example Figure 28 3 DC Noise IBias Test Example 2 Figure 29 1 Transverse VBias Test Figure 29 2 Transverse VBias Example Figure 29 3 Transverse VBias Example 2 Figure 30 1 Transverse IBias Test Figure 30 2 Transverse IBias Example Figure 30 3 Transverse IBias Example 2 Figure 31 1 Angle Transfer VBias Test Figure 31 2 Angle Transfer Example Figure 31 3 Angle Transfer Example 2 Page 4 Integral Solutions Int l October 5 2011 69 70 12 76 76 11 81 81 82 89 89 90 91 9d 98 102 102 Integral Solutions Int l October 5 2011 1 Popcorn Tests NoiseApp Application The popcorn phenomenon is a pulse or a series of pulses that occur after write time which can be interpreted as field transitions in the drive Popcorn Tests require optional component popcorn board In general the tests work by exciting the writer at a defined current and frequency waiting a defined delay period and then measuring Popcorn pulses using either the amplitude threshold or rate qualification method The Popcorn Test also allows the user to sweep up to two parameters frequency wri
20. For y Fi Noise RMS pu 121 506 Max Noise Amp pt 89 852 E ee ee m Noise Amp Max Field D 150 IL H Max Noise mp Max Fiel 150 Noise AMS Max Field O 150 Fu letal 100 Patent Pending Figure 7 2 S M A N II Test Page 21 Integral Solutions Int l October 5 2011 8 W R Recovery Test NoiseApp Application W R Recovery Test places the chip into write mode for a defined duration and then into read mode for a defined duration The test utilizes the Popcorn Board digitizer to capture and look at the read channel immediately after entering read mode 8 1 Expected Utilization This test 1s used to calculate the recovery time of the Preamp chip 8 2 Setup Parameters Cycles Filter Bias On During Write Preamp Gain Write uS Read us Write Current mA Frequency MHz Recovery Definition Recovery Threshold uV Percentage Above Base Noise Recovery Window 8 3 Results Peak Value uV Recovery Time uS Number of Write Read cycles Filter used during the test If enabled the Bias Enable signal is ON during the write portion of the test Some preamp chips in HSA mode do not have Bias Enable signal Use Quasi97 gt Preamp Chip menu to define the state of the bias current in write mode Gain of the preamp chip currently used to calculate Noise amplitude Use it to approximate Preamp RDX RDY output mV Duration to write during each cycle Duration to read dur
21. Integral Solutions Int l October 5 2011 Transverse Transfer Curve ENS Beke pow ee es dp o e e p t Laeda Te B oei a Setup Sept y Add Set Remove Set LR FaSR N A 1 1 362 Transverse 9 17 20123448 Bart pas Cycles fi RunAllSetups Multiple Curves Averages fi IV Symmetrical IV Stress Each Cycle Transverse Transfer Curve Sweep From De 200 To De 200 Inc De fi Bias 3 906474 Part ID 18 Head 40 Measure At Oey 50 es Es Forward Reverse Slope Field Range Oe fio Stress Options Max Slope Field Range De fi 0 1500 Parameters Grades Besa Range Cl ooo 1000 Setup1 Bias Current m 4 94 0 0 4 94 Setupl Min uy 751 97 5 751 97 2 Setupl Max y V 764 77 1764 77 8 3 Setup Pk Pk Asym 084 0 84 E E Setupi Barkh Jump 10 72 0 72 Setupl Hysteresis 2 09 Setupl Max Hyst uy 23 81 o o a Setup1 Barkh Jump At De 193 06 i Setupl Hysteresis Wv 0e 6321 4 500 Setupl Max Hyst t Oe 80 03 4 Setup1 Amp At Test yV 379 03 379 03 Setupl Asym At Test a 0 81 0 81 Magnetic Field Oe Reset Plot Scales Figure 6 3 Soft Kink Transfer Curve Page 18 Integral Solutions Int l October 5 2011 7 S M A N II NoiseApp Application SMAN II test is an extended version of the SMAN test designed to catch both high and low probability rare noise glitches which may not appear in 250uS read tim
22. M A N test sweeps both field and threshold while measuring AC instabilities in the GMR head These results are then normalized to give the user an indication of the amplitude of noise present in the head at a variety of fields 5 1 Expected Utilization The M A N test was developed as a means to catch and quantify heads that display kinks in their transfer curves These phenomena have been linked to losses of Bit Error Rate at the drive level The M A N test is used primarily as an engineering and failure analysis tool although single threshold sweeps can and are used in production applications Single threshold sweeps compare favorably with the AC Noise test which can be run more quickly 9 2 Setup Parameters The setup parameters for the M A N Test are as follows Cycles Filter Bias On During Write Write uS Delay uS Read uS Write Current mA Frequency MHz Do Not Write Field Sweep 9 3 Results Noise Amp uV Max Noise Amp uV Field Oe How many Write Delay Read cycles will be run at each threshold combination Note that at each field MAN test will rerun the threshold sweep Filter used during the test If enabled the Bias enable pin is on during the write portion of the test See Quasi97 User s Manual to find if your hardware supports this functionality Duration to write during each cycle Duration to delay during each cycle Duration to read during each cycle Write current used during t
23. RMS uV Root Mean Square statistic of Noise across the full spectrum 0 15Khz This is independent of unit or scaling selection Peak Amplitude Measured Maximum Amplitude Units are user defined this result just finds the maximum Peak Frequency KHz The frequency at which Peak Amplitude was detected Amp Statistical results including Avg Range Max Min based the raw data Units The units in which the Peak Amplitude and Amp results are reported Scaling The result scaling Logarithmic Linear dBm 11 4 Example of Result and Printout gt _ _ ee tee LPJHD1S Passec T 0 89 DCSpectrumT 12 15 2C 17 41 10_ 1511600012 DC Spectrum Test 1 Bias 10077 Part ID ISI_160001214113209 3 0469167 E DS 04691 Peak Freq Mhz amp 055057E SL B OS50E AMS uv 4 04798011 4 0479 x o D c gt 5 a E E d 7 5 10 0 Frequency KHz Figure 11 1 DC Spectrum Sample Page 32 Integral Solutions Int l October 5 2011 12 Electromigration ElectroApp Application Electromigration is a time stress measurement where resistance will be measured as a function of time For HGA HSA stressing a separate Bias Current can be used vs the default value configured for other measurements For failure analysis 1f resistance exceeds a user defined value during the measurement or changes greatly between time samples or changes greatly with respect to initial measurement the Bias Current will
24. Range zua 50 m Chart Option Multiple Curves Stress a Result Definition 750 Overflow y Voltage mw 883 993 0 0 Current u 8 242 8 242 500 Resistance Ohm 107253 7 107253 7 107253 7 0 0 766 783 765 999 767 722 1 723 871 108 Pk Pk Amp mw 1637 891 s Pk Pk Asym 0 166 250 ed Hysteresis De mV 123633 41 Hysteresis 5 26 684 Max Hyst my 1633 693 5 Max Hyst at De 1 24 E Barkh Jump m 142 247 g y g 0 RR e Barkh Jump at Oe 35 896 35 896 35 896 E Delta RZR 185 234 0 027 Mean Amp mM 52 163 52 878 51 243 Hoffs Qe 0 135 0127 0139 250 He 0e 159496 59632 o 750 LOL 300 250 200 150 100 50 o 50 100 150 200 250 300 Magnetic Field Oe Clear Results Plot Reset Plot Scales Show All Curves Figure 29 2 Transverse VBias Example 51 x Operator ID Tester ID Spec ID Lolo Comment ENL Em AS Transverse Bias 1 Test Time Test Date Time T 8 1 PartID 5 498 7197201 12 58 26 5 493 8 19 201 12 58 03 Cycles 1 Multiple Curves Averages 1 Sweep Oe 400 Inc 0 5 mm Tra hsverse VB 1a S 1 Fine Sweep Dejo Fine Inc 0 5 Bias Part ID Head HdO Range mv 1 5 zi Preconditioning Amp Units Ohm y Forward Reverse NGT Result Definition 142 531 102053 863 Stress 120000 Paramet
25. Test Prefix Enable Example of Result and Printout BH 58Test 1 Hd Grade Cycles Test Time Test Date Time Part ID PISAS 0 38 SBTest 1 10 9 20t 15 11 47 This is the period for which the test sequence will repeat on the bar This parameter controls how many selections you have in the Hd column of the test sequence table The n shown on the list is the remainder from integer division of head number and period n Head number mod Period Buttons for manipulating the rows on the test sequence table Insert appends a row to the beginning of the list Add appends to the end and remove deletes the currently selected row from the screen Button checks for new test setups and new period and based on those repopulates the combobox possible selections in the test sequence table The remainder from division by period see the formula above For example if Period is set to 4 then Hd could be set to n nal n 2 n 3 The test to run on that head The selection is limited to R Sampling Tests for 2xBar Gen3 This 1s the word to be appended to the result before exporting 1t from a test All R Sampling test produce result called Resistance the prefix allows user to differentiate which test was actually executed Enables or disables that particular test execution Remove Number of heads per channel 2 Refresh LG F LG Results Data Parameters Grades MA Resistance Ohm 528 461
26. To measure this without saturating the channel user can select low gain ranges of 1000 3000 or 6500 or high gain ranges 10 30 or 65 This means ranges 1 3 100 300 cannot be used or the channel will be saturated This may be counter intuitive as 65 selection works but 100 does not work but the formula listed above should help Another key factor to consider when choosing one of the high gain ranges is the current difference at Qoe and at user specified field For example if the sensor changes resistance from 10KOhm at Ooe 500mV to 10 5KOhm 525mV at field then the voltage delta is 25mV In this case high gain range the 10mV is really not suitable but the 30mV and the 65mV still are User can set finite number of samples up to 16000 and sampling rate see Sample Time uS parameter This affects the Amp and Amp RMS results only parameters measured at OField are not affected User can choose to display either the sample number or real time on the X axis Also enabled by default is the calculation of higher order statistics Skewness Kurtosis KSL Calculation of these results is somewhat lengthy process so if the results are not necessary user can choose to disable them using Results Definition button and reduce the test time Page 77 Integral Solutions Int l October 5 2011 28 1 Setup Parameters Device IBias uA Field Oe Samples Sample Time uS Range mV X Axis Y Axis Stre
27. angle sweep Rev Min at deg Angle location of the Rev Max Page 101 Integral Solutions Int l October 5 2011 314 Example Printout JO x Device ELG A m WBias fer Do Amp Units Ohm Range 4 u8 3 3 7 Sweep Cycles h Chart Option Multiple Cur Angle Transfer YBias 1 Hd Grade Cycles Test Time Test Date Time PartID Operator ID Tester ID Spec ID LotID Commer P RSC2 2 445 Angle Transfer 3 19 20116 21 27 11 1 Reverse Backu T 34 152 60409 421 cese ackup Angle Transfer VBias 1 neo Ueta Bias Part ID 11 1 Head R5C2 Seem degPiD E eus deg Fine Sweep deg 60 Fine Inc 5 Forward Reverse 140000 Preconditioning AA Preconditioning Stress Options 130000 m V Result Definition 120000 Results Parameters Grades Angie deg me ___ 40 00 50506 1 35 00 50081 326 110000 30 00 49561 359 25 00 49166 981 20 00 48823 706 15 00 48593 296 gt 100000 10 00 48492 799 o 5 00 48322 866 O 0 00 48262 058 5 00 48378 274 90000 10 00 48546 347 E 15 00 48784 218 20 00 49138 387 25 00 49530 003 80000 30 00 49947 701 35 00 50523 706 40 00 51015 391 70000 45 00 51703 517 y 5000 52465412 55 00 53163 967 60 00 54069 615 60000 65 00 55052 365 70 00 56154 257 75 00 57308 728 80 00 58598 039 50000 aaa 85 00 60013 412 30 00 61510 514 95 00 63332 399 65301
28. exact formula is LS xXx x 2 3 O Where N number of data points X the noise amplitudes shown on the plot X the mean noise amplitude O the standard deviation of noise samples Page 74 KSL Overflow Integral Solutions Int l October 5 2011 This result tests for normality of noise distribution First the Z score 1s calculated for each noise value using the formula y MA l O Then the Z scores are sorted from low to high into cumulative fraction plot blue line on the plot below For each point on the cumulative fraction plot the test calculates the probability of the score if it comes from normal distribution x 20 and O 1 red line on the plot below Then at each point the difference from normal probability and actual probability is computed green on the plot below KSL result is the single maximum difference from this plot es DC Noise Data eu NOFM e delta 1 indicates that overflow may have occurred happens when current sensed is more than 95 of the selected range When overflow flag 1s on then the resistance results should be considered invalid Page 75 Integral Solutions Int l October 5 2011 27 3 Example Printout DC Noise YBias ELGA Hd Grade Cycles Test Time Test Date Time PatiD Opera Y 2 tor ID Tester ID Spec ID LotID Comments mu 3 9 201112 05 20 amp B E IE E a aROCC 0 276 DC Noise VBias 8 811
29. field value and shown in the Data tab After that statistical results are calculated and shown on the Results tab of the grid User can enable or disable different stats in Ouasi97 gt Options menu Noise RMS uV Noise Amp uV Max Noise Amp uV Noise RMS Max Field Oe Noise Amp Max Field Oe Max Noise Amp Max Field Oe Noise in uV Root Mean Square value Average of the highest noise value seen in each cycle Highest noise value seen during the test Field that produces the highest Noise RMS value Field that produces the highest Noise Amp value Field that produces the highest Max Noise Amp value 7 4 Example of Result and Printout Spectral Maximum Amplitude Noise Test II Ha Gade Coches Test Tine Test Jato ime ED Filter F2 0 80 MHz Preamp Gain 1282 5 LR SR22 N A 500 0953 S MAN IlTes 6 15 200 125229 _ LKWHKBSB B Cycles 500 Do Not Write v Bias On During Write Spectral Maximum Amplitude Noise II Plot Write US 30 Delay uS 5 Read us 20 Pat ID SR 2 Head SR 15 Write Current m 35 Frequency Mhz 100 From Field Oe 1 50 To Field De 150 Inc Field De 25 Noise Amp Noise RMS Max Noise Amp TITITLE o Pa E FAT gt tn E v Enable Initial Thr ze x L7 gt a o Ss o z 250 200 150 100 50 Bus Oe Clear Results Plot Reset Plot Scales Show All Curves 50 LA A i i Parameters Grades Noise Am pl pr 79 597 M
30. fields are set Standard Quasi97 stress option can be applied here Stress is executed before each cycle field sweep Button opens a menu that allows further customization of results User can enable native results or add custom calculation to be applied to the data Page 100 Integral Solutions Int l October 5 2011 31 2 Native Results All of the native results are repeated from Transverse VBias Check the previous section of the manual for more information on those 31 3 User Results User can add custom results to process the transfer function raw data Click Results Definition and add items to the user results table All of the results available in Transverse VBias are available in this test However the test has a few of unique results listed below 31 3 1 Extremas The Extremas function local minimum and maximum on the specified region If one parameter 1s set for this function then slope will be calculated on the range Center abs Param1 Center abs Param1 If two parameters are set for this function then slope is calculated on the range Center P Center P Forw Max X Maximum found on the forward angle sweep Forw Max at deg Angle location of the Forw Max Forw Min X Minimum found on the forward angle sweep Forw Min at deg Angle location of the Forw Min Rev Max X Maximum found on the reverse angle sweep Rev Max at deg Angle location of the Rev Max Rev Min X Maximum found on the reverse
31. intervals user defined width using a sliding window the step 1s also user defined From the calculated slopes the function finds the maximum and minimum and adds results The calculation occurs separately on forward and reverse sweeps The function requires 3 parameters to run Range Oe WindowSize Oe and WindowStep Oe Max Forw Slope X Signed maximum slope found on the forward sweep Max Forw Slope at Location window where max slope was found on the forward sweep Oe Min Forw Slope X Signed minimum slope found on the forward sweep Min Forw Slope at Location window where min slope was found on the forward sweep Oe Max Rev Slope X Signed maximum slope found on the reverse sweep Max Rev Slope at Oe Location wndow where max slope was found on the reverse sweep Min Rev Slope X Signed minimum slope found on the reverse sweep Min Rev Slope at Oe Location window where min slope was found on the reverse sweep Page 96 Integral Solutions Int l October 5 2011 30 4 Example Printout Transverse IBias ELGB Hd Grade Cycles Test Timo Test Dato Timo PatiD Operator ID Tester ID Spec ID LotID Comment Device ELG B Bias waft PNO Cr NAA 1 74 Transverse IBia 9 20 201 18 52 43 abc TT du m Cycles 1 Averages 1 Sweep De 300 Inc 1 p 62 385 69 279 E i 1 Tran
32. oa 1 O D o a 0 DO o os DO S X E o o a o a E f 1 Um Hee dp RUD Clear Results Plot ESD Profile Curve Bias 5 0 Part ID Head FarHd O 3 5 4 0 4 5 EPS DCDM ESD V Reset Plot Scales Figure 19 1 ESD Sweep Show All Curves Page 49 Coarse Sweep From V h Fine Sweep From V FE Pulse Polarity POS gt NEG f Delay Before Pulse S 0 Pulses Per Voltage h Test At Every Module EPS DCDM Tov 7 Inc V E Fine Inc V i2 Delay After Pulse S o Voltage MFR Amp fio C Pulse MFR Res fi Fail On Parameters Plot Enabled Enabled De E Resistance Ohms Popcorn Noise Amp ut Max Noise Amp pt 5 0 1913 11913 1913 0 0 0 0 0 0 0 0 Completed Completed Completec Complete Complet Integral Solutions Int l October 5 2011 19 1 Setup Parameters The setup parameters for the ESD Control Test are as follows Module Coarse Sweep From To V Coarse Sweep Inc V Fine Sweep From V Fine Inc V Pulse Polarity Pulses Per Voltage Test Every Pulse Voltage Delay Before Pulse S Delay After Pulse S Fail On Parameters MFR Amp MFR Res Type of waveform that is being used This is read from the EEPROM in the ESD device This defines the range for ESD sweep A transfer curve is run before this first pulse is fired Voltage increment used from Coarse Sweep From to Fin
33. peak spectral density Number of 250uS samples to take during the test for averaging Average Write Current mA Write current to be used if writing is enabled during the test Frequency Mhz Write Frequency to be used during the test if writing is enabled Field Oe Magnetic Field to be set prior to the test which will remain during the test Page 28 Integral Solutions Int l October 5 2011 Write During Acquire Enable Disable writing during the test Preamp Gain Preamp gain used during the test to convert Rdx Rdy output to uV 10 3 Results RMS uV Root Mean Square statistic of Noise across the full spectrum 0 80Mhz This result will not depend on units or the scale selected Peak Amplitude Measured Maximum Amplitude Units are user defined this result just finds the maximum Peak Frequency MHz The frequency at which Peak Amplitude was detected Amp Units Scaling Statistical results including Avg Range Max Min based the raw data The units in which the Peak Amplitude and Amp results are reported The result scaling Logarithmic Linear dBm 10 4 Example of Result and Printout Amp uV Peak a alho Dat Daant Dat Canas Clean All Miriana igi xi Hd Grade Cycles Test Time Test Date Time Pat D OperatorID Tester ID SpecID Lot D Comments 4 Fiter F2 0 80MHz y P HD1 S Passec i 1 64 AC Spectrum 1 12 15 2 17 2706 ISI 16000121 AA RBw
34. tester runs initial threshold measurement before digitizing the noise Initial Threshold simply sets user defined threshold and then runs the same sequence of write delay read cycles test only counting the number of pulses that cross the threshold If at least one pulse crosses the threshold then the tester will proceed to Data Acquisition Frame Initial threshold does not apply to the first and the last field setting at those field values the tester runs data acquisition frame to calculate noise metrics If initial threshold is enabled naturally measurements at some fields may be skipped Such measurements will produce OuV Noise Amp Max Noise Amp and Noise RMS in raw data of the SMAN Result Such measurements will not be included in statistical calculations of the SMAN test Ave Min Max Range 6 1 Expected Utilization This test has been proven superior to conventional Transfer Curves at catching noisy or unstable heads These heads normally exhibit soft kinks when using conventional Transfer Curves Fast test time allows for use in Production to catch the same field instabilities as M A N test does Initial Threshold can be used to further optimize the test Page 15 Cycles Filter Bias On During Write Do Not Write Preamp Gain Write uS Delay us Read us Write Current mA Frequency MHz Field Sweep Initial Threshold uV Enable Initial Threshold Integral Solutions Int l October 5 2011 6 2 Setup Para
35. the Chart Option the raw data from each cycle can be preserved or reduced to average or max min values For each cycle the test will calculate a set of results PkPk DeltaR R Hysteresis and others and put them into Results table under columns named C1 Cn From these columns statistical results are then calculated Avg Min Max etc and placed into Result respective stat column The number of samples to take at each field after the field 1s settled These samples are always averaged and only the average is into the raw data The center of the angle sweep Accepts only positive value The main field sweep will start from Center Sweep to Center S weep Signed sweep increment in deg for the main sweep Note that by changing the sign of the increment user can control the direction of the angle sweep For example Center 0 sweep 90 increment 10 will do 90 80 80 90 On the other hand if increment is set to 10 then the sweep will be 90 110 260 270 Page 99 Fine Sweep deg Fine Inc Reverse Use Polar Chart Amp Units Range uA Chart Option Preconditioning Stress Result Definitions Integral Solutions Int l October 5 2011 User has an option to specify different increment in the middle of the sweep If this is set to O then only the m ain sweep parameters are used to generate angle sweep pattern and for calculating all of the results Sweep increment in deg for the fine swee
36. to be formed in the following manner lt Prefix gt lt Result Name gt lt Bias gt T PkPk Amplitude uV 1 Page 47 In addition to results from other tests the test will generate bias result which will be the average of the bias currents used This result is added only in the case of Individual results per bias option is If custom stress option is swept then the name of the stress option Integral Solutions Int l October 5 2011 18 3 Example of Result and Printout m SR Sweep 1 Hd Grade Cycles Test Time Test______ Date Time Pat D fOperatoriD TesterlD Spec ID LotID_ Comments FailCode Data LbHdo Passec 12 082 SH Sweep 4 3 2006 16 28 30 oc ro 93308 From To Inc Bias C Sweep 0 1 0 2 0 1 Discrete fois 00 125 Individual results per Bias n Test 5 Enable Prefix Add Resistance Ohms Avg 304 006 3 26837 eee Noise Count Avg 00 00 00 00 00 WR PeakValue uV Avg 38 403 0 0 3815 3915 0 68062 0 01798 1 019 Register Results WR Peak Value uv Ang 00 00 00 00 00 4 WR Recovery Time uS N 0 647 0 651 0639 0 012 0 010711 0 019 Resut f wg Max Slope Signed sy 0e O Max Slope Amp W MaxSlopeAt Ue O Max Slope Variation uV De O Max Slope Variation At 0e O MeasueAt 0e L Min 4 O Min Amp At Test mv 0d Pk Pk Amp W M PPk Pk Asym M Preamp Amp At Tes
37. user defined From the calculated slopes the function finds the maximum and minimum and adds results The calculation occurs separately on forward and reverse sweeps The function requires 3 parameters to run Range Oe WindowSize Oe and WindowStep Oe Max Forw Slope X Signed maximum slope found on the forward sweep Max Forw Slope at Location window where max slope was found on the forward sweep Oe Min Forw Slope X Signed minimum slope found on the forward sweep Min Forw Slope at Location window where min slope was found on the forward sweep Oe Max Rev Slope X Signed maximum slope found on the reverse sweep Max Rev Slope at Oe Location wndow where max slope was found on the reverse sweep Min Rev Slope X Signed minimum slope found on the reverse sweep Min Rev Slope at Oe Location window where min slope was found on the reverse sweep Page 88 Integral Solutions Int l October 5 2011 29 4 Example Printout Transverse YBias 1 MES CM aROCZN A 13 5 182 Transverse VBi 8 31 201 12 54 30 7 6 Device ELG A Y vBias mv 2500 O aROCzN A 13 5 184 Transverse VBi 8 31 201 11 31 34 176 Cycles 3 aROCz N A 3 1 059 Transverse VBi 8 31 20111 3016 7 5 E df A EA Pn Ll Sweep De 300 Incl pas pa 97 655 779 459 m Fi 6 nm E TE 0 Transverse VBias 1 ine Sweep e nel A t m Sm x Bias Part ID 7 6 Head aROC2 Amp Units P m Preconditioning
38. user replaces the tooling the software will detect this change and automatically ask you to run this zeroing procedure again CMeterApp 5 1 6 Xl 1 2 J Cable offset data does not exist For this tester config and tooling serial number Do you wish to zero out the tooling now If operator makes a mistake calibrate with headstack connected or need to recalibrate this for any other reason he she can go to Add Ins Peripherals gt CMeter Diagnostics and click Zero out cables button in the top right corner im CMeterApp Diagnostics i loj x Cap Hes Cap Res Hex Rez Cable Offs bese une CH 1 FFFF FFFF Texti FF FFFF Testi 0 1 26714 C Gain 7 71 219 Cap offs 51 7 542 CH 2 Testi Tet Text Testi 0 630214 A Gain 1 F offs fo Div bye CH 3 Text Text Testi Text 0 52628 Calbra alibrate CH 4 Testi Texti Tex Testi Capacitance peratian Hex Value Formula CHA Testi Tet Text Testi b ERES amp SRII o BET Label Addr If user wishes to disable this feature altogether then simply delete the cmeterapp xml file after installing quasi97 era aut cabling 24 5 CMeterApp Diagnostics Menu When CMeterApp Application is enabled in the Add ins Selected Modules the test adds a diagnostics menu to Add Ins Peripherals This menu should be used only for hardware troubleshooting when asked by ISI representative Quasi97 5 0 7 SETUP lt qst2002e mds gt LOG lt aa gt File View System Tools Calibra
39. will reset after the test is done Stress option will run for every cycle after preconditioning for the first cycle This is a more flexible interface from transverse test where user had stress each cycle option but only one group of stress options Page 61 Integral Solutions Int l October 5 2011 23 1 Setup Parameters Cycles Averages Field Oe From deg To deg Inc deg Multiple Curves Reverse Show 20 2 Number of times to repeat the angle sweep One cycle includes one forward sweep and reverse sweep Number of measurements to take at each field angle These will be averaged and the average will be displayed in the raw data and on the plot The field magnitude to keep during the test The magnitude will be set at the from Oe angle initially The field angle to start from At this angle the field magnitude will go from Qoe to value specified in Field Oe This is the field angle to end on It can be the same as from deg for 360degree sweep The sign of the increment will also determine which direction the software will use to get to this angle Increment for the sweep Positive for counterclockwise direction Negative for clockwise The test cannot sweep more than 360 degrees Option to display a curve per cycle If this is turned off then before displaying the values from all cycles will be averaged and a single curve will be displayed The option to go back through the same angle
40. 173 183 271 183 098 Mean Amp Ohm 123376 47 123421 01 123309 51 Hoffs Oe 35 746 35 772 35 654 100000 Hc De 21 987 22 027 21 927 Fine Slope Ohm D e 832 697 835 646 829 401 Fine Linearity 1 0 11 0 10 90000 Fine Slope Dey Ohm 17986 97 18018 43 17962 7 Fine Slope Dev at De 0148 11 14 3 9 Fine PkPk Ohm 17411 077 17440 797 17385 07 30000 Fine Max Ohm 101659 94 101708 24 101633 9 F Fine Min Ohm 84248 872 84267 44E 84230 23 70000 vA Fine Asym 10 646 11 206 10 256 Fine Hyst De D hm 595702 6C 596481 20 594764 5 RA ie ee PE cesse A A Fine Hyst 360 503 361 2312 359 991 a a a e o e A II Fine Barkh Jump Ohm 1292 738 1300 175 1253 025 Fine Barkh Jump 7 7 425 7 471 7 265 300 250 200 150 100 50 D 50 100 150 200 250 300 Fine Barkh Jump at De 11 155 2 888 2 063 1 1 Fine Delta R R 5 20 721 20 756 20 69 Magnetic Field Oe Fine HcMax Oe 33 78 33 971 33 663 Clear Results Plot Reset Plot Scales Show All Curves SE ad n aure antt Figure 30 3 Transverse IBias Example 2 Page 97 Integral Solutions Int l October 5 2011 31 Angle Transfer VBias MagneticSensor Application The test sets constant voltage bias and senses current while sweeping the field angle The field magnitude remains the same The angle is swept in forward direction negative to positive and then in reverse direction positive to negative The resultant plot shows the curr
41. 352 67407 291 69874 114 200 150 100 50 0 50 100 150 200 Field Angle deg 100 00 105 00 110 00 Clear Results Plot Reset Plot Scales Show All Curves 115 00 72605163 Figure 31 2 Angle Transfer Example Angle Transfer YBias 1 JD xl Hd Grade Cycles Test Time Test Date Time PatiD Operator ID Tester ID Spec ID Lot ID_ Commer EN com GER 2445 Angle Transfer S 19 20 18 21 43 MA DI jns E Amp Units Ohm 7 Range u8J 3 3 T Sweep Cycles Chart Option Multiple Cur Y Avec 0 Reverse Backup Field 06 250 Use Polar Chart v Sweep deg 21 0 i5 Center deg Fine Sweep deg 60 Fine Inc 5 Preconditioning Preconditioning Stress Options Result Definition Results Parameters Grades Angle Transfer VBias 1 Bias Part ID 11 1 Head R5C2 40 00 50713 914 30 00 49707 233 25 00 49284 176 20 00 48964 298 15 00 48674 183 10 00 48453 588 i 25000 s0p00 75000 100000 125000 5 00 48368 490 0 00 48365 163 5 00 48464041 P 10 00 48533 411 15 00 48931 395 20 00 49202 686 25 00 49641 874 30 00 50001 044 35 00 50567 356 L 40 00 51095 580 45 00 51800 976 50 00 52537044 60 00 54184 127 65002 55235272 70 00 56246 293 75 00 57372 090 80 00 58681 877 270 85 00 60094 472 30 00 61813 623 95 00 63497 248 100 00 y 67527 830 70084 995 Clear Results Plot Rese
42. 5K y Scale 8 y Unt uvPeek o Average o Preamp Gain 2825 Write Current m 35 v write During Aquire Frequency Mhz o AC Spectrum Test 1 Field De D Bias 10077 Part ID ISI 160001214113209 Results Data A likai Result o Amp So 518 DR 724 zu 559 Peak Amp 45 72360 Peak Freq Mhz 40 02441 RMS uv 306 89861 E E 306 86 10 20 30 40 50 60 70 80 Frequency MHz Figure 10 1 AC Spectrum Sample Page 29 Integral Solutions Int l October 5 2011 A AC Spectrum EEN ES 0 80 MHz haz N A 1158 AC Speram Tinaas AC Spectrum Bias 4 9425 Part ID A M n li hi 14 L E y d 4 eT Jt tl i i A E D ie i Li e P t y UE a A RA N dei hy si bedi ra b sd 3 FS NT IPIE ii I p x D 49 J 1 i 3 4 d H L LR A3 h 41 rK RMS uv 0 201 0 0 0 201239 Peak Amp dB 2085 00 2085002 Peak Freq Mhz 17422 00 1742188 LI LI LI LI LI r LI LU LI i LI i LI LU 1 L LI i 1 LI LI L har olor o dr DM Frequency MHz Figure 10 2 AC Spectrum Sample 2 Page 30 Integral Solutions Int l October 5 2011 11 DC Spectrum Test SpectrumApp Application DC Spectrum test allows spectrum analysis of the head amplitude through 0 7 5Khz DC Channel To run the test enable SpectrumApp Application in Add Ins gt Selected Modu
43. Add Ins gt Selected Modules CMeter Hd 1 Capacitance Measurement Oj xj Tris Grade Cycles Test Time Test Date Time PatiD_ Operator resterib Spec 10 cotto Comment o Piot CaF z o ap in i Delay mS lo Preconditioning CMeter Hd 1 Capacitance Measurement Figure 25 1 CMeter Hd Test Other than channel selection which occurs automatically the algorithm 1s exactly the same as CMeter Test Unlike Cmeter this test generates only one set of results Capacitance nF and Resistance MOhm The test does not run on static head in HSA HDA modes Setup Parameters Cycles Number of times to repeat the measurement on selected channels Delay mS Delay between each cycle This delay does not apply before the first cycle Plot User can choose to plot resistance either capacitance or resistance 25 1 Results Unlike other tests the results of this one will appear under STATIC head for HSA HDA tester configurations Capacitance nF The capacitance selected channel Head selection measured during the test Note that the module may show extremely large capacitance if piezo is shorted to ground The value of 999 999nF means hardware overflow error this capacitance is not real Resistance nF The resistance on channel N The test module will not be able to measure resistance correctly outside of specified range The high resistance values will be trimmed to 200MOhms Page 69 25 2
44. C Spectrum Sample 32 Figure 12 1 Electromigration Test 34 Figure 13 1 Bias Angle Test AMR head 35 Figure 14 1 Resistance Delta Test 36 Figure 15 1 Asymmetry Test 38 Figure 16 1 Stability Test 40 Figure 17 1 Breakdown Voltage Test Algorithm 41 Figure 17 2 Breakdown Voltage Test Result 43 Figure 18 1 SR Sweep Test 44 Figure 18 2 SR Sweep with Custom Stress Parameters 45 Figure 18 3 SR Sweep Results 47 Figure 18 4 SR Sweep Test Example 1 48 Figure 18 5 SR Sweep Test Example 2 Individual Results per Bias 48 Figure 19 1 ESD Sweep 49 Figure 19 2 ESD Control Test 51 Figure 19 3 ESD Control Transfer Curve 51 Figure 20 1 Temperature Sweep Mode 52 Figure 20 2 Temperature Constant Mode 52 Figure 20 3 Temperature Pulsed Mode 52 Figure 20 4 Temperature Control Sweep Mode 54 Figure 20 5 Temperature Control Transfer Curves Sweep Mode 54 Figure 21 1 Transverse Magnet 55 Figure 21 2 Side Field Magnet Installation 55 Figure 22 1 S8Test Menu 57 Figure 22 2 Barcont Tester Options 57 Figure 22 3 S8Test Data Logging Example 58 Figure 22 4 S8Test Base Tests Setup Example 58 Figure 22 5 S8Test Result 59 Figure 22 6 S8Test Result in Production 60 Figure 23 1 Angle Transfer Test 61 Figure 23 2 Angle Transfer Example 64 Figure 24 1 CMeter Test 65 Figure 24 2 CMeter Test Example 66 24 3 CMeter EEPROM 67 24 4 Cable Offset Normalization
45. Cycle Transverse Transfer Curve Sweep From De 150 To De 150 Inc 0e 1 Amplitude uv Bias 4 94 Part ID Bar 1 Head FarSR 1 Ea SSS Forward Reverse 0 Magnetic Field Oe Measure At De 50 Slope Field Range De fi 0 Max Slope Field Range Oe 10 Stress Options Results m Setup entar Une TE 3 T a 7 n l Setup Min uv 163316 00 169316 Setup Max p 3978 3 00 3983 Setup Pk Pk me uv 9671 461 0 0 sen 461 Setup Pk Pk Asym 2 4023 00 Setup Barkh Jump pY 1674 00 Setup Barkh Jump 2 235 0 Setup Barkh JumpAt Qe 12102 00 Setup Hysteresis IOa 20191 53 0 0 Setup Hysteresis 3 1304 10 0 Setup Max Hyst pW 17235 00 Setup Max HystAriDe an joo Selupl Amp At Test jV 26586 00 Setup sym At Test amp 29 16 0 0 Setuol Hyst At Test S 10 06 0 0 Setup Hyst At Test uO 6041 98 Setup Barkh Jump At Tes 77 49 Reset Plot Scales Show All Curves Setup Barkh Al Test Ame 291 Figure 5 2 Transfer Curve Test Soft Kink Page 14 Integral Solutions Int l October 5 2011 6 S M A N NoiseApp Application Spectral Maximum Amplitude Noise test is designed to quickly measure the spectral noise density as a function of magnetic field utilizing AC channel and 160Mhz 10 bit digitizer Optionally user can enable write stress to catch both writer induced and field induced noise To Field De From Field De
46. D C N Neg Pk Pk Amb Temp C 0 85 23 88 Delta Pk Pk uV 2002 9375 0 Delta Pos Amp u 1445 918 012 Delta Neg Amp uV 138 7287 10 DeltaAsym 44396 2000 00 9 Ages y gt o o a a n H 4 4 2 a Bias Current mA ____CearResuts Pot_ RestPotSoses E E Figure 15 1 Asymmetry Test Page 38 Integral Solutions Int l October 5 2011 16 Stability SweepApp Application Stability 1s a time stress measurement where either Amplitude and or Amplitude Asymmetry can be measured as a function of time During the stability measurement the stress parameter will be toggled for a user defined duration of time then returned to its original value After a fixed channel settling time Amplitude and or Amplitude Asymmetry will be measured Simultaneously Ambient Temperature will be measured to support measurements performed in temperature controlled environments All results are dynamically plotted real time on the graph 16 1 Setup Parameters Averages Number of averages per each point measured Bias Current mA Bias current to be used during the test in mA Test Duration Number of iterations the test will run Field Oe Strength of magnetic field to be used in Oersteds Stress Options Type of stress condition to be used See Stress Options in Quasi97 User s Manual 16 2 Results Res Ohm Resistance measured during the test Pk Pk Amp uV Peak to Peak Am
47. D IO IE ee E O Sweep Parameter 0PS Spier Static Field Y Pole De s Individual Result j REM per Setting From To Result vg Mas Min Bias 200 1 400 1 0 1 Sweep 0 1 500 100 Noise Count Max 10 0 0 Discrete Asym At Test 2 Ava 0 0 Test Enable Prefix Insert PAC Noise Test viv Trnsvesei Ml Add Remove Register Results _ Resut Avg Min Max Rng COV COD Std Missing Noise Cont O M L1 JC L L OO Barkh Jump Min 0 0 Barkh Jump At Test 2 M 0 0 Barkh Jump Rev p Ma 0 0 Bias Current m Avg 0 0 0 0 Resistance Ohms Avg Clear Results Plot Remove Missing Resuts Figure 18 2 SR Sweep with Custom Stress Parameters Page 45 Integral Solutions Int l October 5 2011 18 1 Setup Parameters Sweep Parameter Sweep Discrete From To Inc Discrete Individual Results per Setting Register Results The custom stress to sweep or Read Bias The sweep option can change bias current linearly using From To and Increment For the Discrete option user can specify values in any order separated by semicolon For sweep mode the initial value For sweep mode the maximum value in the sweep For sweep mode the increment The increment can not be zero The string with discrete bias values separated by the semicolon For example 1 100 0 3
48. ICATION TEMPERATURE TESTS TEMPAPP APPLICATION SIDE FIELD OPTION SIDEFIELD APPLICATION SSTEST SSMODULE APPLICATION ANGLE TRANSFER TEST QPSSPLITTER APPLICATION CMETER TEST CMETERAPP APPLICATION CMETER HD TEST CMETERAPP APPLICATION MAGNETIC SENSOR MAGNETICSENSOR APPLICATION DC NOISE VBIAS MAGNETICSENSOR APPLICATION DC NOISE IBIAS MAGNETICSENSOR APPLICATION TRANSVERSE VBIAS MAGNETICSENSOR APPLICATION TRANSVERSE IBIAS MAGNETICSENSOR APPLICATION ANGLE TRANSFER VBIAS MAGNETICSENSOR APPLICATION Page 2 Integral Solutions Int l October 5 2011 10 12 13 15 19 22 24 28 3 33 35 36 37 39 41 44 49 52 55 57 61 65 69 71 72 77 82 90 98 Integral Solutions Int l October 5 2011 Table of Figures Figure 1 1 Popcorn Test Digitizer 6 Figure 1 2 Popcorn Sweep Sample 7 Figure 1 3 Popcorn AC Field Sample 7 Figure 2 1 DC Noise Screenshot 9 Figure 3 1 AC Noise 11 Figure 4 1 Noise Sweep 12 Figure 5 1 M A N Test 14 Figure 5 2 Transfer Curve Test Soft Kink 14 Figure 6 1 SMAN Test Diagram 15 Figure 6 2 Soft Kink S M A N Test 17 Figure 6 3 Soft Kink Transfer Curve 18 Figure 7 1 SMAN II Test Diagram 19 Figure 7 2 S M A N II Test 21 Figure 8 1 W R Recovery Test 23 Figure 9 1 Noise Profile Algorithm 24 Figure 9 2 Noise Profile Test Results 27 Figure 10 1 AC Spectrum Sample 20 Figure 10 2 AC Spectrum Sample 2 30 Figure 11 1 D
49. MB voltage m p2 Bb MA Current m s ELG Resistance Ohm 634 233 ELG Voltage mw 63 49 ELG Current m s Figure 22 5 SSTest Result Page 59 Integral Solutions Int l October 5 2011 JA Test Sequencer Firadutisis Passes 1 E Pest On essi ern B oo Comunication Production 1 I Display Plots i Aus da l Calibration Required to run test Production 1 Were md mper SL Production Meis Production 1 J Enabled Production 1 Production RR Froduction 1 IE 0 406 Production gt a E co i enu Dao min ra 63 I Hr a Abort remaining tests for head on failure en oo en DDD n i gt I p Igi rn a T DO ud LI I in on Do Fa En EM a m EE on Do Fa mm la gt L ow Ja Fa etest on Failun m ee BT est O uasi Static Tests dfh cold O uasi Static Tests dfh hot E MAN Test O Grades YE jts Grade Summary esistance Delta 1 E rines A AAA 2 E Results 1 ata Parameters L THA Resistance D hm S87 est 828 451 528 451 m PreTest Resistance Ohm Production 2181 472 Fetested Head Production AN Preamp AutoDetect Production o Insert Item Append Item Renove ten Clear Results C Noize 1 C Hoike MAM I Test ransverse Figure 22 6 S8Test Result in Production Page 60 Integral Solutions Int l October 5 2011 23 Angle Tra
50. Min Max Rng COV COD Std Missing gt Amp Noise Count Peak Amp Peak Freq Mhz RMS uv ID DEN E E IDODDO Dobon Dobon Dobon Dobon idodao Dobrlo Figure 18 3 SR Sweep Results October 5 2011 After clicking Register Results the test will show what is going to appear under the result tab Even if the user does not click Register Results button the test is going to do it automatically the very first time it runs However until that time user clicks Register Results or runs the SR Sweep test the selections in Grading Data Logging custom results and other menus are not going to be updated If the individual results per setting option is turned off the raw data gets populated with results The test captures specific results from other tests in the sequence and saves them under the data tab raw data for SR Sweep test In this case the result name is going to be formed in the following manner lt Prefix gt lt Result Name gt lt Statistical column gt T PkPk Amplitude uV Min Bias turned OFF will appear instead Note that the space does not appear after prefix but does after result name If the individual results per bias option is turned on then the raw data of SR Sweep test is left empty The results are imported straight into the test statistics In this case the result name is going
51. S o n bd Delay mS o Channel Enable CH 1 CH 2 O Preconditioning CMeter 1 Capacitance Measurement 1 00 Ss S Figure 24 1 CMeter Test The test measures both capacitance and resistance on up to 2 channels The results are logged on the static head line in HSA HDA mode This test does not generate header or result on the normal head lines see CMeter Hd test for Piezo testing at HGA level The capacitance range for the module is 0 05nF 50nF the resistance range is from 0 3 200MOhm For the duration of the measurement the test disconnects the QST side from the PZT line and then connects it back allowing Point to Point and Point to Ground measurement on those lines available in Static Tests To test capacitance and resistance the module applies up to 5V on the PZT line vs chassis ground The measurement time is about 1 5second for single cycle on single channel Different test times may appear depending on the resistance and capacitance of the device under test This test 1s multi setup capable which means that user can create more than one setup of this test in one MDS file User can enable one or both channels for measuring capacitance and add multiple cycles and watch capacitance or resistance change over some time The user has an option to display one of the channels on the screen either capacitance or resistance although typically the test would be used with 1 cycle There is preconditioning option
52. Scale Show All Curves Figure 17 2 Breakdown Voltage Test Result Page 43 Integral Solutions Int l October 5 2011 18 SR Sweep SweepApp Application The SR sequence rerun sweep test allows rerunning a group of tests at several bias currents or custom stress values Unlike regular Sweep Test in Quasi97 this module allows user to select several tests and to run at the same bias The test does not have any results of 1ts own 1t can only copy the results of other tests However the name of the result can be modified with a prefix to differentiate two tests of the same type on the sequence d Bias Sweep 1 Hd _ Grade Cycles Test Time Test Date Time Pat D OperaterID TesterlD SpecID Lot D Comments Fail Code Data LbIHdO Passer T 18 267 4 8 2008 15 45 02 Rm a 20393 0Bf From To Inc Results Parameters Grades E oe Hex Wax Mn Penge 9 0 92007 1 839 1 00 00 00 00 00 00 00 00 12 91 m Pk Pk Amp uv Avg 92 59 Pk Pk Amp uv Ang 00 00 00 00 00 00 Pk Pk Asym Avg 11 267 65 3085 37 35 18 74115 1 65336 3 315 Register Pess T Resistance Ohms Avg 307 416 321 578 299 72 21 851 12 2799 0 03994 0 071 Slope 4 06 Max 0 35425 Result Avg Ang COV COD Std Lost_ Slope uy 0e Min 0 95425 Noise Count O jw jw MO Noise Amp uv Min Noise AMS Wv Ang 0 058 0068 0045 0023 0 01168 0 20137 0 397 N
53. Spectral Maximum Amplitude Noise Plot F art ID d Haad ER 35 Moise Amp Moise RMS Max Moise Amp Mose uv Field De Patent Pending OST External Tests User s Manual ZA Integral Solutions Int October 5 2011 Copyright 2003 2011 Integral Solutions Int l All rights reserved Integral Solutions Int l 3000 Olcott St Santa Clara CA 95054 Phone 408 653 0300 Web http www us isi com Fax 408 653 0309 E mail 1s1 Ous 1s1 com While every effort has been made to verify the accuracy of the information contained in this publication this publication may contain technical and or typographical errors Please contact Integral Solutions Int to report any errors in this publication Contents POPCORN TESTS NOISEAPP APPLICATION DC NOISE TEST NOISEAPP APPLICATION AC NOISE TEST NOISEAPP APPLICATION NOISE SWEEP TEST NOISE APP APPLICATION MAXIMUM AMPLITUDE NOISE TEST NOISE APP APPLICATION S M A N NOISEAPP APPLICATION S M A N II NOISEAPP APPLICATION W R RECOVERY TEST NOISEAPP APPLICATION NOISE PROFILE TEST NOISEAPP APPLICATION AC SPECTRUM TEST SPECTRUMAPP APPLICATION DC SPECTRUM TEST SPECTRUMAPP APPLICATION ELECTROMIGRATION ELECTROAPP APPLICATION BIAS ANGLE SWEEPAPP APPLICATION RESISTANCE DELTA SWEEPAPP APPLICATION ASYMMETRY SWEEPAPP APPLICATION STABILITY SWEEPAPP APPLICATION BREAKDOWN VOLTAGE SWEEPAPP APPLICATION SR SWEEP SWEEPAPP APPLICATION ESD STRESS TEST ESDAPP APPL
54. alculation User can select one of the gains available in the hardware by using this parameter Ranges 1 3 10 30 65 are using the high gain mode while 100 300 1000 3000 6500 are using the low gain mode Applies if user specifies more than one cycle Available choices are Avg Curve Multiple Curves and Range Curve Multiple Curves will display amplitude curve per cycle as a separate lines on the plot Avg Curve first averages the data from all cycles and then displays n E a single curve AMPgyg H aa Range Curve creates two data columns for amplitude one for maximum and the other for minimum The resultant plot reflects repeatability of the dut at any given field Page 91 Preconditioning Stress Result Definitions Integral Solutions Int l October 5 2011 Standard Quasi97 stress option can be applied here including field angle Preconditioning is executed once before test s vbias and fields are set Standard Quasi97 stress option can be applied here Stress 1s executed before each cycle field sweep Button opens a menu that allows further customization of results User can enable native results or add custom calculation to be applied to the data Page 92 Integral Solutions Int l October 5 2011 30 2 Native Results Since user can select units for amplitude the units in some of the results will be updated too In order for the test to work properly with logging and grading amp unit
55. and reverse amplitudes at Center field parameter where Ampois the average for Hyst Oe X f Manus Abs F H R H dH where F H is amplitude on the center P1 forward sweep and R H is the amplitude on the reverse sweep P and P are the parameters specified by the user for this function Hyst 96 l center P2 F H E R H 100 Hysteresis f Min dH center P4 2 Barkh Jump X The maximum difference of A H and A H Inc where A 1s the continuous transfer function In other word the maximum jump in amplitude that occurred on forward or reverse sweep Page 94 Integral Solutions Int l October 5 2011 Barkh Jump 1004 Barkh Jump PkPk Barkh Jump at Oe The location of the Barkh Jump Delta R R 100 d where Rois the amplitude measured at center field 0 The PkPk is measured inside the subset range 30 3 3 HC Max The function HcMax function finds the maximum hysteresis within a subset range If one parameter is set for this function then slope will be calculated on the range Center abs P Center abs P If two parameters are set for this function then slope is calculated on the range Center P Center P HcMax Oe The maximum difference in Oe between forward and reverse sweep HcMax at Oe The location where HcMax was found 30 3 4 HSat Fits the following model to the transfer function and reports Hsat coefficient Amin Amax A H Amax Hof fs
56. ange Curve creates two data columns for amplitude one for maximum and the other for minimum The resultant plot reflects repeatability of the dut at any given field a single curve AMPgyg H Standard Quasi97 stress option can be applied here including field angle Preconditioning is executed once before test s vbias and fields are set Standard Quasi97 stress option can be applied here Stress is executed before each cycle field sweep Button opens a menu that allows further customization of results User can enable native results or add custom calculation to be applied to the data Page 84 Integral Solutions Int l October 5 2011 29 2 Native Results Since user can select units for amplitude the units in some of the results will be updated too In order for the test to work properly with logging and grading amp units should be selected first Then the test results can be added to selective logging and grading In the following table X indicates a unit that user selects Overflow Voltage mV Current uA 2Pt Resistance Ohm Resistance Ohm Min X Max X PkPk Amp X Pk Pk Asym Hysteresis Oe X Hysteresis 96 Max Hyst X Max Hyst at Oe Barkh Jump X Barkh Jump 96 Barkh Jump at Oe Delta R R 96 dR Rmin 96 1 if overflow may have occurred otherwise 0 If overflow flag is on then the results should be considered invalid The voltage measured across the
57. ant current bias to set on the device for the duration of the test The number of times to repeat the field sweep Depending on the Chart Option the raw data from each cycle can be preserved or reduced to average or max min values For each cycle the test will calculate a set of results PkPk DeltaR R Hysteresis and others and put them into Results table under columns named C1 Cn From these columns statistical results are then calculated Avg Min Max etc and placed into Result respective stat column The number of samples to take at each field after the field is settled These samples are always averaged and only the average is into the raw data The center of the sweep normally Ooe The field sweep and many of the results are based on this center For example asymmetry will be calculated with respect to this center parameter Takes only absolute value The main field sweep will start from Center Sweep to Center Sweep Sweep increment in Oe for the main sweep User has an option to specify different increment in the middle of the sweep If this is set to O then only the m ain sweep parameters are used to generate field pattern and for calculating all of the results Sweep increment in Oe for the fine sweep If Fine Sweep is set to 0 then this parameter is discarded Parameter determines units to put on the Y axis as well as the units for the Amp result uV mV and Ohm are available See notes above for details on the c
58. ative or either change You can enable showing parameters on the ESD Sweep Plot Specifies percentage difference in Amplitude at which HBM voltage will be used for MFR calculation Default 10 Specifies percentage difference in Resistance at which HBM voltage will be used for MFR calculation Default 1 Page 50 Integral Solutions Int l October 5 2011 19 2 Example of Result and Printout Cycles Test Time Test Date Time ParlD__ Operator ID Tester If Farque N A 131 77 ESDSystemCc 4 18 02 132331 Paid tj ESD Profile Curve Bias 4 0 Part ID PartID Head Farqure Le POS EE dien E EAN NN SS LI MALTA ANT IN E A 1 E E S EE Jo LL IA 1 ee laa la RR 0 51 dabane AA C w 2 5 5 0 7 5 10 0 12 5 15 0 17 5 20 0 EPS DCDM ESD V Te Paemeer PotEnsbled ESDCont Transe S PKPRAmpW MT ESDCont Transfe Resistance Ohms H O ESDCont Transte PkPkAgm d MC Bakhium V O O Resistance Ohms Pk Pk Amp uv Bias Current m 4 0 40 MFR Z 1000 100 Resut Completed Complet Pk Pk Asym 96 E ESD Transfer Curve 8 1 208 ESDContTrans 4 18 02 132528 PauD p pa AMAS 1 3779 ESDCont Trans 4 18 02 13 25 23 PatlD y Cycles m MES fans ESDCont Transfer Curve alld Bias 4 0 Part ID PartID Head Farqwe SLT Aa RERO m f uo C 23 3 S
59. be shut off and the test will abort early During this measurement Ambient Temperature will also be measured supporting measurements performed in temperature controlled environments All results are dynamically plotted real time on the graph 12 1 Setup Parameters Averages Bias Current mA Test Duration Hrs Max Res Ohm Min Res Ohm Delta Res Ohm Delta Res Interval S Max Res Change Ohm 12 2 Results Res Ohm MR Temp C Amb Temp C Bias Current mA Initial Resistance Ohm Max Resistance Delta Ohm Final Resistance Ohm Total Resistance Change Ohm Number of averages per each point measured Bias current to be used during the test in mA Length of test in hours Maximum resistance threshold for the head in Ohms Test will abort if this threshold is achieved Minimum resistance threshold for the head in Ohms Test will abort if this threshold is achieved Maximum resistance change per individual sample for the head in Ohms Test will abort if this threshold is achieved Interval between time samples in seconds Decimal value is allowed Maximum amount the resistance can change from the initial resistance of the head in ohms Test will abort if this threshold is achieved Statistics of resistance calculated from raw data Statistics of MR Temperature calculated from raw data in C Statistics of ambient temperature calculated from raw data in C Measured bias current us
60. beginning and end of the test Starting MRR ending MRR and MRR Delta will be reported as a result Amp Threshold uV Amplitude Threshold useful to maximum noise amplitude Frequency MHz Write Frequency Read Bias mA Read Bias Write Current mA Set Register Addr Val Write Current Set certain registers on the preamp to specified values All of the above parameters can be swept using standard From To Increment or at every Discrete Value The Enable Discrete Values check box must be enabled to check for popcorn pulses at discrete values 1 2 Example of Result and Printout Popcorn Test le ele e Te EP E e peer ese E FarSR N A 9 17 20 10 36 36 Bar1 Cycles 1 Popcorn JV Amp Quality Rate Qualify FarSR N A H 59 FaSR N 1 0 411 Popcorn Popcom 9 17 200 10 36 35 Bar1 Popcom Digitizer Popcorn Pulses Par ID Head Hd 2 I 3555 Barl Fiter F2 0 80MHz x reme En Test Mode Ppom rj v Bias On During Write Amp Threshold uv 498 6 Rate Threshold uW 15 nS 898 Write Current m s 5 Frequency Mhz o Write US a Delay Read andi Delay Pre Conditioning Stress Options 3 Field Parameters Field De 150 Vv Manaus Resistance at Start and End of Test DC Field AC Field Parameter mp Threshold ut edo bald li de LA AMM PRE HIT PT INTANT UN JA Liu id ui IS E TT EEE PL LE p
61. c an ee si ito rs a mind Barkh Jump 5 34 5 34 534 Barkh Jump At 0E 49 77 49 77 49 77 O i 1 1 1 Hysteresis p V oE 857 54 857 54 857 54 0 i Hysteresis 313 313 313 o 150 L i Max Hyst ny 15 26 15 26 1526 0 1 i 1 1 1 Max Hyst At oE 71 78 71 78 71 78 0 100 50 o 50 100 Amp At Test ut 124 21 124 21 124 21 0 Magnetic Field 0E Asym At Test 2 2 21 2 21 2 21 0 kd in At At AQ 77 40 77 AQ 77 n Figure 20 5 Temperature Control Transfer Curves Sweep Mode Page 54 21 Side Field Option SideField Application Integral Solutions Int l October 5 2011 The Side Field option includes QMS 1050 or magnet driver Side Field Magnet and PCI 6024E Data Acquisition card Side Field magnet allows study of the effect of longitudinal field on the head 21 1 Option Installation To install side field option remove four screws from the standard Transverse magnet and put in side field magnet as shown below mount it using screws 1 and 4 Connect the side field magnet to QMS Connect QMS 1050 to the PCI 6024E card in the computer Note that PCI 6024E card has the same connector as NI PCI DIO 32HS card which 1s connected to QST tester These cards are not interchangeable and switching the cables can cause hardware damage Install Quasi97 minimum version 1s 3 2 22 and enable SideField Application in Add Ins gt Selected Modules Refer to Quasi97 Users Manual for more
62. calculate Noise amplitude Use it to approximate Preamp RDX RDY output mV Number 100mS cycles 1 1000 This is the number of yellow Squares as shown on the test flowchart The qualifying threshold to start digitization Noise spikes below this threshold are going to be ignored If enabled the test runs at one field only from field This is useful in Sweep Test in case other parameters needed to be swept as well The starting field The last magnetic field to sweep The field increment If enabled will skip the remaining cycles if the number of digitized spikes RD windows reached maximum error count The maximum number of spikes to digitize at any field Page 25 Integral Solutions Int l October 5 2011 9 4 Results Results are calculated at each field independently and then Quasi97 statistics calculate Min Max AVG across several fields Start Stop Slideshow Slideshow speed Digitized Pulses Field Average Peak Noise uV Noise Sigma uV Peak Noise uV Noise Count Noise Percentage Avg Peak Noise Max Field Peak Noise Max Field Number of Plots to Save Shows each noise spike on the plot for a user defined period of time After 1t finishes all the noise spikes the software restarts Controls how fast to change slides during the slideshow Upon selecting any row on this table the digitized pulse 1s shown on Digitized Data plot Shows the field at which the results where ca
63. custom calculation to be applied to the data Amplitude of the device at field measured during the test This can be in uA uV Ohm or mV See description above for more details on the various unit selections Root means square calculation on the amplitude data This is useful to gauge the noise of the device when using uV or uA selection The voltage measured across the device before the field is applied typically Ooe This is a direct measurement of voltage drop on the Vsense probe pins The current measured at the device before the field is applied typically Ooe VBias 10 Equals to ChannelResistance Current The ChannelResistance is calibrated down to 100 ohm so this result is not as accurate as the next Resistance ohm result However this allows measuring device resistance in case of bridge measurement where Vsense pins are placed on a different set of pads than Vsource and isolated through some significant resistance Apt resistance result calculated by dividing voltage sensed by the Voltage 10 Current current sensed The result shows the degree of asymmetry of distribution around its mean The exact formula is scA x x oe O Where N number of data points X the noise amplitudes shown on the plot X the mean noise amplitude O the standard deviation of noise samples The result shows the relative flatness of distribution relative to standard distribution The
64. device before the field is applied typically Ooe This is a direct measurement of voltage drop on the Vsense probe pins The current measured at the device before the field is applied typically Ooe VBias 103 Equals to ChannelResistance rrent The ChannelResistance is calibrated down to 100 ohm so this result 1s not as accurate as the next Resistance ohm result However this allows measuring device resistance 1n case of bridge measurement where Vsense pins are placed on a different set of pads than Vsource and 1solated through some significant resistance 4pt resistance result calculated by dividing voltage sensed by the Voltage 10 Current current sensed Minimum amplitude measured Forward and Reverse sweeps are averaged and then minimum is found on the resultant curve Maximum amplitude measured Forward and Reverse sweeps are averaged and then maximum is found on the resultant curve Max Min 100 gt Abs Max Ampo Abs Min Ampgo Abs Max Ampo Abs Min Ampgo forward and reverse amplitudes at Center field parameter where Ampois the average for E center sweep Abs F H R H dH where F H is amplitude on the forward sweep and R H is the amplitude on the reverse sweep center sweep F H R H 100 Hysteresis 2 center sweep Min dH The maximum delta between F H and R H on the sweep range The location of the maximum difference between F H
65. ds If both tests have the same Prefix defined in SS Test then S8Test will generate Resistance result on odd and even heads even though they come from different instances of R Sampling The following screenshot illustrates another example in which the probe card is made as follows READ Channel is connected to Read Element on Head O ELGA Channel is connected to ELG on Head 0 AUX Channel is connected to Read Element on Head 1 ELGB Channel is connected to ELG on Head 1 Jo xi Cycles Test Time Test Date Time ParttID aa SBTesti 10 9 20 15 11 47 Number of heads per channel 2 Insert Add Remove Refresh v R Sampling Test RD R Sampling Test ELGA R Sampling Test AUX R Sampling Test ELGB Sist Figure 22 1 S8Test Menu The S8Test runs R Sampling Test RD and RSampling Test ELGA on head 0 2 4 6 etc On heads 1 3 5 7 etc the R Sampling Test AUX and RSampling Test ELGB are executed instead Thanks to the same prefix name the test produces the results with the same name on both heads Note that to achieve this Number of heads per channel 1s set to 2 So head number from Quasi97 will be divided by 2 and the remainder n will be the determining factor for running the tests It is user s responsibility to create and maintain the R Sampling Test setups needed to achieve this task In the example above the RD ELGA AUX and ELGB are the names o
66. e Sweep From Voltage This defines the voltage at which the Fine Inc starts being used Voltage increment used from Fine Sweep From to Coarse Sweep To POSITIVE NEGATIVE or POS NEG and NEG POS Type of pulse to be fired for each voltage increment In POS NEG and NEG POS modes both a positive and a negative pulse are fired at each increment with separate measurement taken after each firing Number of pulses fired at each voltage increment Defines how often the system will test the MR element If testing at every new voltage then plot will be FailOn Parameters VS ESD Voltage V If testing each pulse then plot will display Fail On parameters VS Data Points It is recommended to graph ESD Volt when testing every pulse Time in seconds to wait before firing a pulse Delay of 1 will wait for user input after before every pulse Time in seconds to wait after firing a pulse Delay of 1 will wait for user input after before every pulse Define Fail On Parameters for monitoring head characteristics They can be from any available test and if enabled can abort ESD Sweep test in mid run when fail on criteria is met To use a parameter enable it and then set the limits to be used for that parameter Max and Min limits are in the units of the results The Delta is defined as the percentage change from the initial reading before the first ESD pulse Delta Direction column tells the software whether to abort on positive neg
67. e X E Abs F H R H dH where F H is amplitude on the forward sweep and R H is the amplitude on the reverse sweep P and P are the parameters specified by the user for this function Page 86 Integral Solutions Int l October 5 2011 Hyst USACE a eR NM 100 Hysteresis Min dH center P4 2 Barkh Jump X The maximum difference of A H and A H Inc where A 1s the continuous transfer function In other word the maximum jump in amplitude that occurred on forward or reverse sweep Barkh J ot Barkh Jum ar ump Jo 10018 Jump PkPk Barkh Jump at Oe The location of the Barkh Jump Delta R R 100 EO where Rg is the amplitude measured at center field 0 The PkPk 1s measured inside the subset range 29 3 3 HC Max The function HcMax function finds the maximum hysteresis within a subset range If one parameter is set for this function then slope will be calculated on the range Center abs P Center abs P If two parameters are set for this function then slope is calculated on the range Center P Center P HcMax Oe The maximum difference in Oe between forward and reverse sweep HcMax at Oe The location where HcMax was found 29 3 4 HSat Fits the following model to the transfer function and reports Hsat coefficient Amin Amax A H Amax 2 H Hoffs 14e Hsat No parameters are required the fitting is done on the whole sweep HSat Forw Oe Hsat res
68. e from 10KOhm at Ooe 25uA to 10 5KOhm 23 8uA at field then the current delta is 1 2uA In this case high gain range of 0 5 is not suitable but 1 5 and 3 3 are suitable High gain mode can be selected such that Range gt Page 82 Integral Solutions Int l October 5 2011 29 1 Setup Parameters Device VBias mV Cycles Averages Center Oe Sweep Oe Inc Fine Sweep Oe Fine Inc Amp Units Range uA The set of probes to measure on Available choices are Reader special hardware required Aux ELGA ELGB ELGC ELGD Constant voltage bias to set in the test Note that due to hardware design the voltage at the device will be different from this because of 2Kohm resistance in series with the device under test This is simple voltage divider So for example for 100mV Vbias setting on 50Kohm load will result in 96mV across the device The number of times to repeat the field sweep Depending on the Chart Option the raw data from each cycle can be preserved or reduced to average or max min values For each cycle the test will calculate a set of results PkPk DeltaR R Hysteresis and others and put them into Results table under columns named C1 Cn From these column statistical results are then calculated Avg Min Max etc and placed into Result respective stat column The number of samples to take at each field after the field is settled These samples are always averaged and only t
69. e of the SMAN test To Field De From Field De Time SMAN Data Acquisition SMAN 250uS Data Acquisition Cycle 1 Cycle 2 Cycde 3 cle Cycle 1 Cycle 2 Cycle 3 Cycle 250 uS Read uS Figure 7 1 SMAN II Test Diagram SMAN II test same as SMAN produces three results MaxNoiseAmp NoiseAmp and NoiseRMS The results are calculated from digitized noise acquired at every field value and are plotted on the graph At each field value we run two parts of the test SMAN II longer and SMAN shorter and then combine the data to calculate the final results For the first part SMAN II we set a threshold and run N cycles of Write Delay Read sequence Threshold Write Delay Read sequence and the number of cycles are all user defined If during the read portion of any cycle a noise spike crosses the threshold then the tester records the digitized data from that cycle So at the end of SMAN II segment of the test we have digitized noise only from cycles where the noise spikes were higher than specified threshold For example after running 1000 cycles of 50uS Write 5uS Delay and 10uS Read with 75uV threshold cycles 24 300 and 875 have glitches higher than 75uV The software then uploads all 30us 3 10 of digitized data from those cycles Then we analyze the data and find the amplitude of the highest noise spike in each cycle MaxAmpcz1 MaxAmpc399 and MaxAmpes7s and the maximum of th
70. e test Voltage Bias 107 The result shows the degree of asymmetry of distribution around its mean The exact formula is x E O Where N number of data points x the noise amplitudes shown on the plot X the mean noise amplitude O the standard deviation of noise samples The result shows the relative flatness of distribution relative to standard distribution The exact formula is l n x x i TER 3 O Where N number of data points x the noise amplitudes shown on the plot X the mean noise amplitude O the standard deviation of noise samples Page 79 KSL Overflow Integral Solutions Int l October 5 2011 This result tests for normality of noise distribution First the Z score 1s calculated for each noise value using the formula y TA l O Then the Z scores are sorted from low to high into cumulative fraction plot blue line on the plot below For each point on the cumulative fraction plot the test calculates the probability of the score if it comes from normal distribution x 20 and O 1 red line on the plot below Then at each point the difference from normal probability and actual probability 1s computed green on the plot below KSL result 1s the single maximum difference from this plot es DC Noise Data eu Norm e delta indicates that overflow may have occurred happens when voltage sensed is more than 9596 of the s
71. e with Ibias equal to the current measured at O field on the device under test This is still a relative unit to the value measured at Ooe mV Volt 10 is absolute voltage on the device This is recalculated using current and resistance measured at Ooe field Ohm Resistance of the device at field 4Pt mV True voltage across the device measured at field Use this if need be in the applications where Vsense probes are connected to a different set of pads from Vbias probes The test adds all three factors that may have been used to recalculate Amp Voltage mV Current uA and 2Pt Resistance Ohm These results are measured at Ooe field Test features selectable measurement range for the 14 bit ADC The smaller the range the better is the resolution Ranges 5 15 50 150 325 are using the low gain mode while 0 05 3 3 are using the high gain mode These modes may be of interest VBias 102 Rmin VBias 10 2 100 Rmin For example 10Kohm device with 250mV VBias requires 25uA max current To measure this without saturating the channel user can select low gain ranges of 50 150 or 325 or high gain ranges 0 5 1 5 or 3 3 This Low gain mode is straight forward the Range must be gt High gain mode can be selected such that Range gt Page 98 Integral Solutions Int l October 5 2011 may be counter intuitive at first as 3 3 selection work ok but 5 or 15 does not work but 1f the formula listed above 1s used there sh
72. ed during the test Measured initial resistance before the start of the test Maximum resistance delta from one sample to another Final resistance at the end of the test Total resistance change between initial resistance and final resistance Page 33 Integral Solutions Int l October 5 2011 Test Result Test completion code O Test completed normally Resistance Delta was exceeded Maximum Resistance change was exceeded Minimum Resistance was exceeded Maximum Resistance was exceeded 12 3 Example of Result and Printout Electro Transfer Function Head Grade Cycles Test Time Test Date jPatlD Operator TesterID__ Comm 4 po N fi 36028 8 19 99 319 33PM PatiD OperatorlD TesterlD Comrr Averages 10 Bias Current m s E 0 Electromigration Plot Test Duration His foo Part ID Part ID Max Res Ohm 75 E Min Res Ohm 15 Resistance MR Temp Amb Temp Delta Res Ohm E 42 25 Delta Res Interval 5 E 41 Max Res Change Ohm 5 E 40 20 5 S ry B 15 3 m 38 E in 10 P D o 37 e 36 Initial Resistance Ohm 38 64199 E E ooo E DO VA LLL LLL A LLL Ll lt a I L mq Test Result 0 i O O RA F 40 2 QU er PA is a o eee 0 0 000 0 001 0 002 0003 0 004 0 005 0006 0 007 0008 0 009 0 010 Time Hrs Clear Results Plot Reset Plot Scales Show All Curves Figure 12 1 Electromigra
73. elected range When overflow flag is on then the resistance results should be considered invalid Page 80 Integral Solutions Int l October 5 2011 DC Noise IBias ELGA Hd Grade Cycles Test Time Test_______ Date_ Time____ PartID____ Operator ID Tester D Spec ID Lot ID_ Comments 4 28 3 Example Printout Stress Options Result Definition m RE IBias u amp 1 DO ullo 5 o0 D o 9 on 8 DC Noise Bias ELGA Part ID 8 6 Head aROCO 5 6 D 11 52 25 AM aR oct 0 212 DC NoiselBias 9 9 201111 52 28 106 l l l 907 10002 530 10012 5 10010 0 10007 5 Hi 10000 0 100 200 300 400 500 600 700 800 900 1000 O Sample Figure 28 2 DC Noise IBias Test Example Reset Plot Scales Clear Results Plot mu evi efEL A IBias uA 250 s E ss ons 0 esult Definition 4 2 E o a 3 E Du o v E 5 g a o v Oo E pA bu Li E uU D Range my 10 VA mm E UU UL LL A Part ID Head Hd 1 DC Noise IBias 1 0 295 DC Noise IBias DC ois Hd Hd gt 57 458 463 NENNEN 11 51 47 AM 15 20 Time mS Reset Plot Scales Clear Results Plot 2 DC Noise IBias Test Example Figure 28 3 Page 81 Integral Solutions Int l October 5 2011 29 Transverse VBias MagneticSensor Application The test measures field transfer function of magnetic sensor It does so by setti
74. elected will appear on the result grid after running the SR sweep test The checkbox indicates that the results shown on the grid existed before but are no longer registered This could happen 1f user selects a different test in the test grid or 1f after upgrading the software the test itself no longer supports such result Note that even though the result is missing the software will still reserve a row for 1t This command deletes all results for which the Missing checkbox is On in the result grid Page 46 Integral Solutions Int l 18 2 Results The SR Sweep does not have any results of its own The list of the results depends on many user selections so do expect that after changing the sweep range or any other parameter of SR Sweep the results generated by this module may change grading selective data logging menu and others may have to be updated To see the list of results with current parameters simply click Register Results button a m _ a SR Sweep 1 E L Hd Grade Cycles Test Time Test_____ Date Time PatID OperatoriD TesterlD Spec ID Lot ID Comments FailCode Data Results Parameter Bias Sweep C Discrete From To Inc 0 1 0 3 01 Individual results per Bias lv Insert Add Test Enable Prefix LP DC Spectrum Test 1_ y Iv Remove Register Results Resut 5 5 Avg
75. ent or resistance change at the device vs angle User can enable Cartesian or polar coordinate plot Angle Transfer Bias 1 B x Hd _ Grade Cycles Test Time Test Date Time _ PartID__ Operator ID Tester ID Spec ID Lot ID_ Commer eo fis NA Osta Ange Tia 2 201 1655 06 aa apear mm RN evice simv 100 Amp Units Ohm Range uA 325 E Sweep A gt Cycle aL Chart Option Multiple Cur y i Angle Transfer VBias 1 Averages 0 o EE So AA pda Field 0e 300 Use Polar Chart I Bias Part ID Head Hdl Sweep deal nelis Center deg 0 Fine Sweep deg 45 Fine Incf5 r Preconditioning Preconditioning Stress Options Result Definition 1250 Figure 31 1 Angle Transfer VBias Test Forward Reverse The test uses step settle and measure algorithm After setting each angle the test waits until the magnetic field 1s settled and then takes one or several measurements Several measurements at each angle are then averaged and placed into raw data table into the Amplitude column The units for the amplitude result are set by the user from several available choices The amplitude can be displayed in the following units uA Ampere 10 is relative to the current sensed at 0 field Amp AmPeriela AMP eo uV Volt 10 is uA recalculated to more conventional unit for amplitude using devices resistance In other words this 1s what the amplitude would b
76. ep Bias To Bias Increment Magnetic Field oE Resitance Trendline ax 248 ve POTU Results Paramete Grades 57 1 53 Bias m Show All Curves Figure 14 1 Resistance Delta Test Page 36 Integral Solutions Int l October 5 2011 15 Asymmetry SweepApp Application The Asymmetry Measurements sweeps Bias Current while measuring Amplitude and Amplitude Asymmetry The field strength during this measurement 1s user selectable 15 1 Setup Parameters Cycles Averages Sweep From mA Sweep To mA Sweep Inc mA Magnetic Field Oe 15 2 Results Amb Temp C Resistance Ohms Delta Pk Pk uV Delta Pos Amp uV Delta Neg Amp uV Delta Asym Number of iterations the entire test will be run Number of averages per each point measured Starting bias current in mA Ending bias current in mA Amount to increment bias current in mA Strength of magnetic field in Oersteds Ambient Temperature in degrees Celsius measured during the test Measured resistance before the test Change Peak Peak in uV Delta Positive Amplitude in uV Delta Negative Amplitude in uV Relative change in Asymmetry Page 37 Integral Solutions Int l October 5 2011 15 3 Example of Result and Printout Asymmet Transfer Function Head MEO LA O TR CO TR OOS 31722 PM AE O r 2 929 139 402 Asymmetry Plot Fart ID Part I
77. ers Grades 115000 Result Avg Mas Min Range 4 Voltage mV 193 804 193 804 Current us 2 957 2 957 110000 i 65534 39 65534 39 65534 39 65297 21 65297 21 65297 21 120511 37 120511 37 120511 3 105000 55214 15 55214 15 55214 15 00 Pk Pk Asym 2 1 483 1 483 1 483 Hysteresis De Dhm 18303941 18303941 18303941 100000 Hysteresis 59 157 59 157 e Max Hyst Ohm 54834 227 54834 227 54834 22 Max Hyst At De 29856 29856 5 95000 Barkh Jump Ohm 53763 04 53763 04 53763 041 Barkh Jump A 97372 97 372 a Barkh Jump At Oe 335 449 335 449 90000 Delta AZRA 84 252 84 252 84 252 0 0 et 85000 80000 75000 70000 65000 400 300 200 100 0 100 200 300 400 Magnetic Field Oe Clear Results Plot Reset Plot Scales Show All Curves Figure 29 3 Transverse VBias Example 2 Page 89 Integral Solutions Int l October 5 2011 30 Transverse IBias MagneticSensor Application The test measures field transfer function of magnetic sensor It does so by setting constant current bias and sensing voltage while sweeping the field The field 1s swept in forward direction negative to positive and then in reverse direction positive to negative The resultant plot shows the voltage or resistance change at the device vs field Transverse IBias 1 7 Oj x Hd _ Grade Cycles Test Time Test_ Date Time ParID_ Operator ID Tester ID_ Spec ID LotID Comment EN A
78. es ES Figure 30 2 Transverse IBias Example Transverse IBias ELGB rf oed Hd Grade Cycles Test Timo Tost JDoto Time PatiD Operator ID Tester ID Spec ID Lot ID Comment Device ELG B isto PAO Cr N A S 18425 Transverse Bia 9 20 201 18 51 30 abc uy el Cycles 5 Averages pap gt ALAN ge 300 EE Center De fo e queens Transverse IBias ELGB Fine Sweep Qel0__Fine Inc 0 5 Bias Part ID abc 91 Head 0 1 CR1C3 Range miv 3000 x1 Preconditioning el i ud ET Amp Uns Ohm Stress Forward Reverse Chart Option Multiple Curves A 180000 RS RS RR PA 0 ResultDefinition Results Parameters Grades 170000 1 LL Lola l l1 VIZ C rm B B Overflow 160000 Voltage mV 840 278 840 278 840 278 n Current ue 10 0 10 0 10 0 T T TT gy m ores restore 150000 j Min Ohm 64397 19 64412 05 64374 90 Max Ohm 182355 5E 182429 9 182244 2 LL TZ TPA c X he are at 140000 Pk Pk Asym 53152 53 197 53 1 Hysteresis Oe D hm 5582044 E 5530020 55715971 A VA cm ee 2130000 Max Hyst Ohm 41924 77 41976 77 41865 33 8 II JP Sa unr aT O Barkh Jump Ohm 1292 738 1300 175 1263 025 120000 1 Barkh Jump 1 096 1 103 1 071 e Barkh Jump at De 3 961 7 839 0 0 E j Delta R R 140 38 140 451 140 274 110000 dR Amin 183
79. esired tab or by selection from the combo box Number of averages per each sample point measured If enabled in 8X HGA mode the tester will run for all heads selected in the Options menu In Sweep and Ramping modes this item defines the starting temperature In Constant and Pulsed modes this item defines the base temperature In Sweep and Ramping modes this item defines the ending temperature In Constant mode this item defines the peak temperature In Pulsed mode this item defines the soaking temperature Increment used in Sweep Ramping and Pulsed modes Specifies bias current used during the test In Ramping mode specifies the Bias to sweep from Only used in Ramping mode Specifies bias current to sweep to during the test Only used in Ramping mode Specifies bias current increment during the test In Constant mode defines the duration of the test when sample time will be used In Constant mode defines the duration of the test when sample time B will be used Total Test Time is test time Test Time B In Constant mode defines how often a transfer curve is run in Test Time In Pulsed mode defines soaking duration In Constant Mode defines how often a transfer curve is run during Test Time B In Pulsed mode defines the duration to stay at the base temperature after the measurement This option will run all tests at the peak temperature as well as the base temperature Both at base and peak temperatures the test
80. etup1 Bias Current m 14 0 40 Setupl Resistance Ohms 81 9 819 Setupt Min p 1153 1153 jSetupl Max yV 3229 3228 Setupl Barkh Jump At De 36 02 3602 jSetupl MaxHyst uV 16 06 1606 5 5 5 Amplitude uv m X 27 2 etup1 Hyst At Test Z 161 161 etupl Hyst At Test pv 0 491 51 491 51 i 1 1 etup1 Barkh Jump At Tes Che Dll Ab Taak tAr 10019 Figure 19 3 ESD Control Transfer Curve Page 51 Integral Solutions Int l October 5 2011 20 Temperature Tests TempApp Application The Temperature Control Tests utilize LakeShore331 temperature controller that is optional to the QST system The Temperature Control Tests allow characterization of the MR heads under user defined temperature conditions There are four test modes each allowing sampling of Amplitude Asymmetry Resistance and Transfer Curves at specific temperatures Sweep Mode Test changes the temperature incrementally and samples at each temp value Ramping Mode Test sweeps bias currents at each point of a temperature sweep and samples at each new bias current and temperature Thermal Stability Constant Mode The test measures once at a base temperature Test From and then performs samplings at a peak temperature Test To Base peak temperature and sample interval are user defined At the end of test time one final measurement will be taken at the base temperature Two independent sample i
81. f R Sampling instances added by user to that particular setup file The number of tests as well as the period are not limited within reason so user can add as few as zero tests for some heads and as many as 16000 This test operates independently from BlazerX5 neither Barcont will know from this test how many sliders to step nor will this test get the period from Barcont So in order to use the probe cards connected to 4 and 8 heads at the same time user also needs to change of Sliders Probed Simultaneously in Barcont gt Tester gt Options Menu Default Setup Directory C Program Files ntegral Solutions IntlKBlazeb Btc Default Tray C Program Files Integral Solutions Intl Blazer UST Testing r LED Contra all v v Align Align Use Probes gt Stress Probe Card Present E LED ON 7 BACK Of v Alig Figure 22 2 Barcont Tester Options Page 57 Quasi97 4 5 15 SETUP lt C Documents and Settings ISI Desktop gen3 2 mds LOG lt C Documents and Settings ISI My Documents abc gt Integral Solutions Int l October 5 2011 File View System Tools Calibrate Add Ins Diagnostics Help S M A N II Test 1 dy Transverse i Y Popcorn 1 R Sampling Test ELGA Add Remove 00 098m Options General Log File pen File Close File Type Microsoft Excel Workbook xls Extension xis Statistics To Log Only used when Select Individual Statistics f
82. file Algorithm Page 24 Integral Solutions Int l October 5 2011 The test has Early Abort condition for faster execution Before running next 100mS cycle the test checks if the number of digitized luS windows already exceeds user specified Max Error Count If so then the test 1s going to proceed to the next field otherwise it is going to run the next 100mS cycle The Max Error Count needs to be enabled for this check to occur First the results are calculated for each field the noise statistics are calculated from all RD windows and all 100mS cycles combined at each field Then statistics are calculated across all fields and added as results of the test Each digitized pulse is added to the Digitized Pulses table where user can select any one and view it or start the slide show 9 1 Expected Utilization This test 1s used to characterize the high frequency noise on the head It provides the visual feedback to the engineer of how the noise spikes look like The test also calculates the frequency of qualifying noise spike occurrences noise statistics including average max sigma and percentages and shows the fields where the maximum noise occurs 9 2 Setup Parameters Filter Preamp Gain Cycles Threshold Fixed Field Oe From Field Oe To Field Oe Inc Field Oe Enable Early Abort On Max Error Count Max Error Count 9 3 Filter used during the test Gain of the preamp chip currently used to
83. gitizer Popcorn Pulses Pan ID Head Hd 2 _ Amplitude uv FT CT TTP e Clear Results Plot Reset Plot Scales Show All Curves Figure 1 3 Popcorn AC Field Sample Filter F1 D 30 MHz v Amp Qualify Rate Qualify Preamp Gain 270 Test Mode Popcom y v Bias On During Write Amp Threshold uv 31 2 Write Current m 35 Rate Threshold uv 7 15 n5 90 4 Frequency Mhz E 00 Write us 50 Delay 2 Read fro Delay fo w Multi Events Per Cycle V Digitize Pulse V Do Not Write ESTE M Resist t Pre Conditioning Stress Options Iv SU id End of Test Field Parameters Field Oe 150 C DCField AC Field Write Current m Frequency Mhz e Parameter E Discrete Values Enable Discrete Results 35 11628 35 12247 s 0 006 Page 7 Parameters Integral Solutions Int l October 5 2011 2 DC Noise Test NoiseApp Application DC Noise test measures the amplitude of the head without sweeping magnetic field The acquired amplitude is shown as a function of sample To calculate back to real time use QST sample rate of maximum 156KHz The main result is amplitude use different statistics to find out the Max Min Avg and Range The test calculates additional statistical results on the acquired noise including Skewness Kurtosis and the KSL Kolmogorov Smirnov Lilhefors 2 1 Expected Utilization The DC Noi
84. gnostics Help Transverse 1 Y Popcorn 1 il S M A N II Test 1 E Production 1 A Static Tests d R Sampling Test ELGA im R Sampling Test ELGA Add de Static Tests Sweep Test dem Production B Extra Ee BU Write Profile R Sampling Test Remove Test Hd Grade Cycles Test Time Test_____ Date Time PartlD LP SA 53 R Sampling Tes 10 9 20 15 11 47 Cycle Delay mS Averages E fo R Sampling Test ELGA ELG A SR53 Bias Range p Bias E LL AO A AAA A gt E B g Contact Test iva Isolation Test E Electro amp pp Applicatior B NoiseApp Application a DC Noise AS 1 Resistance Ohm 2 H E AC Noise Test ca MM Noise Sweep X Popcorn E MAI MAN Test E n E E o y E a An n av d sman nie 7 1 y P2 B E W R Rec Test 5 EE Noise Profile Test E CETT Windowed DC No E Sweep4pp Applicatior s8module application aa S8Test 31 033 094 093 nss 100 Clear Results Plot Reset Plot Scales Show All Curves Figure 22 4 S8Test Base Tests Setup Example o 096 os 41 gt Page 58 mm A Stress Options Measurement Gain 4 1000 mv y 2m4 y o1 m y Votage nV To aen H ht is log Integral Solutions Int l October 5 2011 22 1 Setup Parameters The setup parameters for the S8Test are as follows Number Of Heads Per Channel Period Insert Add Remove Refresh Hd
85. he average 1s into the raw data The center of the sweep normally Ooe The field sweep and many of the results are based on this center For example asymmetry will be calculated with respect to this center parameter Takes only absolute value The main field sweep will start from Center Sweep to Center S weep Sweep increment in Oe for the main sweep User has an option to specify different increment in the middle of the sweep If this 1s set to O then only the m ain sweep parameters are used to generate field pattern and for calculating all of the results Sweep increment in Oe for the fine sweep If Fine Sweep is set to O then this parameter is discarded Parameter determines units to put on the Y axis as well as the units for the Amp result uA uV mV Ohm and 4Pt mV are available See notes above for details on the calculation User can select one of the gains available in the hardware by using this parameter Ranges 5 15 50 150 325 are using the low gain mode while 0 05 3 3 are using the high gain mode Page 83 Chart Option Preconditioning Stress Result Definitions Integral Solutions Int l October 5 2011 Applies if user specifies more than one cycle Available choices are Avg Curve Multiple Curves and Range Curve Multiple Curves will display amplitude curve per cycle as a separate lines on the plot Avg Curve first averages the data from all cycles and then displays Y Ampi H n R
86. he test Frequency written during the test If enabled the test will be executed without writing Min Max and Increment Field to be run The amplitude of the noise in uV The maximum amplitude of noise acquired Swept field Avg Max Min etc Page 13 Integral Solutions Int l October 5 2011 5 4 Example of Result and Printout Maximum Amplitude Noise Test Hd Stade Cycles Test Tine Test iDate Time lPatiD Operator D Tester ue LR FaSRIN A 500 20 501 MAN Tes 9 17 20 11 31 46 Bari Noise Amplitude uv 600 500 400 300 200 ba Maximum Amplitude Noise Plot Part ID Head 2 lt a Ea ES Noise Amp Max Noise Amp E vat ft p WA fT Tol Br mm Pre rra 0 50 100 150 150 100 0 Field Oe Clear Results Plot Reset Plot Scales Show All Curves Filter Fi 0 30MHz y Preamp Gain 270 Cycles 500 v Bias On During Write Write uS 50 Delay uS 2 Read uS 23 Write Current m 35 Frequency Mhz fi o0 v Do Not Write Pre Conditioning Inc Enable Discrete Field De 150 150 10 PL Parameters Noise Amp ip 113742 TA 651 Max Nase Amp uv 156748 5 553 Figure 5 1 M A N Test Transverse Transfer Curve Si lol x jet he ee AZ PEE s y Add Set R Set LR FaSR N A 1 171 Transverse 9 17 200 11 41 15 pe EEG A E Cycles fi Run llSetups Multiple Curves Averages fi IV Symmetrical IV Stress Each
87. head instabilities The test digitizes luS of data at a time using the amplitude threshold trigger as a qualifier The total read window of each cycle is about 100mS during which the test digitizes a maximum of 50mS of noise only the qualifying noise spikes are digitized and stored under the Field Cycle and Timestamp identifiers The test has two plots one displays noise amplitude vs field similar to SMANID and the other shows individual noise spikes that crossed user defined threshold via slide show To Field Oe From Field De Delay 1u5 Read tuS digitize 1u5 data if over the threshold Max Error Early Abort Enabled AMD YES Digitized RD Count gt MAX Error Count Mext Field The test sweeps field At each field dark blue square the test runs user defined number of 100mS cycles 1 1000 cycles is supported by software During each cycle yellow squares the test sets the user defined threshold trigger if the noise from the head gets higher than the threshold then it is digitized and stored in the internal memory The total acquisition time during one cycle is 50 000 uS This time is not continuous as the test needs time to store the short bursts of digitized data So during the 100mS cycle the test runs 50 000 small RD windows light blue which consists of lus delay and lus read time If the noise spike qualifies higher then threshold then the luS window where it occurs is digitized Figure 9 Noise Pro
88. il On Parameters Enabled Fail On Parameters Delta Fail On Parameters Min Fail On Parameters Max Fail On Parameters Statistic 17 2 Integral Solutions Int l October 5 2011 17 1 Setup Parameters The test type Cycle mode will keep the same stress bias for each cycle whereas Sweep will increment bias for each cycle For sweep mode the initial bias voltage or current 1f below 20 For sweep mode the end bias voltage or current 1f below 20 Bias Increment for the sweep mode voltage current 1f below 20 The total number of cycles to run the test only Cycle test mode The bias voltage or current 1f below 20 to be applied during the stress interval The bias to be applied in between the stress interval The tests specified under failon parameters will run at this bias The stress interval or how long the stress bias will be applied for This 1s applicable to both sweep and cycle test mode The number could be decimal but stress time below 0 1s 1s not supported Percentage change in amplitude from the first data point pre stress which would indicate the head failure This will be used to calculate the failure voltage result for the head The test will keep running after MFR Amp is reached Percentage change in resistance from the first data point pre stress which would indicate the head failure This will be used only to calculate the failure voltage result The test
89. imum number of sample allowed by the hardware Cycles will be automatically adjusted based on the read duration set by the user Shorter read duration has more cycles Filter Filter used during the test Bias On During Write If enabled the Bias Enable signal is ON during the write portion of the test Do Not Write If enabled the head will stay in the ready mode during the write periods of the test Data will not be acquired during write period so write time essentially becomes a delay Preamp Gain Gain of the preamp chip currently used to calculate Noise amplitude Use it to approximate Preamp RDX RDY output mV Write uS Duration to write during each cycle Delay uS Duration to delay during each cycle Read us Duration to read during each cycle Also used to define how many cycles to run recommended 5us Write Current mA Write current used during the test Frequency MHz Write frequency used during the test Field Sweep Min Max and Increment Field to be run Threshold uV The threshold for the first segment of the test The cycle will be digitized only if noise glitch amplitude from that cycle is higher than the threshold Enable Initial Enabling Initial Threshold will speed up the test Threshold Fixed Field Run the test at a single field value useful when running SMAN II as a part of sweep test Page 20 7 3 Results Integral Solutions Int l October 5 2011 Following results are measured at each
90. information on how to do that Figure 21 2 Side Field Magnet Installation To calibrate side field magnet go to Calibrate menu in Quasi97 and click on Calibrate Side Field Insert the Gauss meter probe in the magnet close to the location of the MR head Enter the readings from the Gauss meter and Save to EEPROM Unlike transverse magnet the Side Field does not produce a large area with uniform field therefore the field gain should be calibrated after installation and if a different tooling is used if head location within the magnet changes It should also be recalibrated when the gap between faces of the magnet is changed Page 55 Integral Solutions Int l October 5 2011 21 2 Testing A new parameter Side Field Oe will appear in the transfer function test If a parameter 1s not zero then Quasi97 will turn on side field during transfer function test The application could also run in stand alone mode where you can check resistance of the magnet read QMS EEPROM and set field Use screws 2 and 3 to adjust the magnet gap length see picture above The following table shows approximate maximum field for the side field option as a function of gap width Use it to set the magnet gap width appropriate for your application For example if gap size is 1 and the head 1s located right in the center of the magnet 0 5 2 0 25 the maximum field will be 224 Oe Field Reference Table at 10 Amps Distance 1 4
91. ing each cycle Write current used during the test Write frequency written during the test Absolute Threshold The recovery time will be defined as the first point below this threshold when no following points exceed this threshold Percent Above Base works just like Absolute Threshold except the Threshold is calculated as a percent of the baseline value Baseline is sampled without writing Threshold used if Absolute threshold method is enabled Percentage above Base Noise the threshold 1s set at if Percent Above Base method 1s used If the channel is recovered for this length of time the channel is considered recovered Any events after this happens are considered as separate events Highest Peak in uV Recovery Time as calculated using Recovery Definition Page 22 Integral Solutions Int l October 5 2011 8 4 Example of Result and Printout ia W H Recovery Test Hd Grade Cycles Test Time Test DateTime PatlD Oper LR Ha4 N A 1 0 109 wRhRecTes12 1 0 144721 10 138 59 637 W R Recovery Sub Title Peak Value pt 71 951 71 951 71 9514923C PE js Eee Ph a 13 ML HO cul LE eT AA AS A a Ni AB 5 A AAA AMY 71 951 IN BEEN B E S E o T 2 a E E Dj Figure 8 W R Recovery Test Page 23 Integral Solutions Int l October 5 2011 9 Noise Profile Test NoiseApp Application The noise profile test is using the high frequency AC channel to digitize
92. itches in the path is calibrated only down to tens of ohms and may be variable from channel to channel The Bias tests have been added to complement VBias modules in other words to generate the same results and the same units as VBias test but using 16 bit 2mA constant current source The current bias source 1s better calibrated so these tests may be used for magnetic sensors with resistance smaller than 10Kohm to gain higher accuracy in resistance and amplitude reading Note that running Bias tests on high resistance devices will skew the results because of the long settling time of the constant current bias source while running VBias tests on low resistance devices is subject reduced accuracy So while these sets of tests generate the same results they will always have some differences The tests can run on one of the 2xBar Gen3 devices selectable in each test in the Device combo box Refer to your probe card design to determine which device this should be measured on Note that in order to run on VBias tests on Reader device special rework to disconnect QST bias source from the reader is needed Bias tests can still run on Reader without problems Page 71 Integral Solutions Int l October 5 2011 27 DC Noise VBias MagneticSensor Application The DC Noise VBias is the first test in of the Magnetic Sensor test suite Primary function of the test is to set constant voltage and measure current at the device in order to calculate resi
93. k Amp uv 125 53 425 9 452 55 834 12 618 5 3278 k Pk Asym 2 125 2 323 10 96 17 45 872534 3 756 Resistance Ohms 125 303 828 303 828 5 0 0 0 0 0 0 oise Count 125 E e E 5 38 27 38 27 WR Recovery Time pS 1 0 651 0 651 BEER ERES seal o ome Bar Kem RS no co en a i gt ER 00 a EZ n a D i o lt a fa E s n3 Pspsserrocecea DoDoopspanenaE pooo HHHHSEH ESSES DEE ii e El Remove Missing Resuts Figure 18 5 SR Sweep Test Example 2 Individual Results per Bias Page 48 19 ESD Stress Test ESDApp Application Integral Solutions Int l October 5 2011 The ESD Control Test utilizes equipment that 1s optional to the QST system The ESD Control Test allows characterization of the MR heads vs defined ESD Stress Please see your ESD Hardware Option Manual for more information The test 1s setup to run any tests after stressing the head with ESD and plot any results from those tests Several fail on parameters are defined by the user to abort the test under various conditions The ESD Control Test can also work with certain HSAs with reset pulse In these cases all ESD voltages are in terms of the DAC values programmed for controlling Reset Pulse amplitude AS ESD System Tests Hd Grade Cycles Test Time Test_ Date Time Pat D Operator ID Tester IC m LR FaHd N A 1 1894 93 ESD SystemCc E 14 02 14 18 13 Mp Ten d M N
94. lculated in the table The statistics of this parameter are meaningless This is used only as a header for better representation of results Average 1s the sum of all peak amplitudes divided by the number of digitized cycles If the RD window is not digitized it is neither included in the sum nor the total cycles yo DigitizedRDwindow PeakNoiseAmplitude 15t _ DigitizedRDwindow Number _of _ Digitized _ RD _ windows Standard deviation of Peak Noise gt _ DigitizedRDwindow PeakNoise AVGPeakNoise Number _ of _ Digitized RD windows AVG Peak Noise uV is the above result PeakNoise is the peak noise from a digitized cycle i l st _ DigitizedRDwindow This is the maximum peak noise encountered in any RD window at each field Number of cycles where the noise was detected above the threshold Noise count divided by the total number of RD windows attempted The field where the highest AVG peak noise was calculated The field where the highest Maximum peak noise was found If the setting is more than O then the test saves digitized Plots in JPEG format in the location of the log file name If the general log file is c Data AAA CSV then the plots are saved in c Data AAA folder Unlike the general plot logging available in Quasi97 this option saves the digitizer plot instead Amplitude VS Field plot Page 26 9 5 Example of Result and Printout Noise Profile Test 1 Hd Grade Cycles Te
95. le if user sets 300 software will change the setting to 512 This is an inverse of the sampling rate to use The minimum is 0 1us 10MHz and the maximum is 25 5uS 40KHz The DC channel has 7KHz low pass filtering so main purpose for this setting is to complement Samples parameter to define the sampling interval User can select one of the gains available in the hardware by using this parameter Ranges 5 15 50 150 325 are using the low gain mode while 0 05 3 3 are using the high gain mode Parameter determines which units to put on the X axis Sample Number and Time mS are available for user to select Values can also be plotted vs Field but currently the test does not allow setting more than one field so if this option is selected then all the points are stacked together at a single X position Parameter determines units to put on the Y axis as well as the units for the Amp result uA uV mV Ohm and 4Pt mV are available See notes above for details on the calculation Standard Quasi97 stress option can be applied here including field angle Stress is executed once before test s vbias and fields are set Page 73 Result Definitions 27 2 Results Amp Amp RMS Voltage mV Current uA 2Pt Resistance Ohm Resistance Ohm Skewness Kurtosis Integral Solutions Int l October 5 2011 Button opens a menu that allows further customization of results User can enable native results or add
96. les DC Spectrum test takes samples of analog buffered head voltage output and then uses Fast Fourier Transforms to plot head amplitude Db as a function of frequency Khz Results include RMS uV Peak Amplitude dB and Peak Amp Frequency MHz 11 1 Expected Utilization Engineer can set different magnetic fields and do the analysis of lower frequency components of the spectrum 11 2 Setup Parameters RBW Scale Unit Average Field Oe Read Bandwidth The test will acquire amplitude at this interval 125Hz 62 5Hz 31 25Hz 15 63Hz 7 8Hz 3 9Hz 5 Hz Linear Logarithmic dB 20Log aay luV AuV 715uV The units for the results are selected here The raw data in AC Spectrum test will be in these units Then you can find out the range Max Min by enabling different statistics from Tools menu uV rms amplitude rms micro volt at each frequency Logarithmic with fixed reference dBm 20Log uV Peak amplitude maximum micro volt at each frequency uV rms Power RMS uV peak Power uV rms amplitude rms spectral density amplitude peak spectral density N Hz 2 UV ins Hz power rms spectral density 2 uV power peak spectral density Number of times the test is rerun for averaging Magnetic Field to be set prior to the test which will remain during the test Page 31 Integral Solutions Int l October 5 2011 11 3 Results
97. meters Number of Write Delay Read cycles The test will try to acquire maximum number of sample allowed by the hardware Cycles will be automatically adjusted based on the read duration set by the user Shorter read duration has more cycles Filter used during the test If enabled the Bias Enable signal is ON during the write portion of the test If enabled the head will stay in the ready mode during the write periods of the test Data will not be acquired during write period so write time essentially becomes a delay Gain of the preamp chip currently used to calculate Noise amplitude Use it to approximate Preamp RDX RDY output mV Duration to write during each cycle Duration to delay during each cycle Duration to read during each cycle Also used to define how many cycles to run recommended 5us Write current used during the test Write frequency written during the test Min Max and Increment Field to be run If enabled at each field test measures noise at this threshold first and if the noise count 1s O then the test skips current field and go to the next one Enabling Initial Threshold will speed up the test Page 16 Integral Solutions Int l October 5 2011 6 3 Results Following results are measured at each field value and shown 1n the Data tab After that statistical results are calculated and shown on the Results tab of the grid User can enable or disable different stats in Ouasi97 gt Options menu
98. module calculates statistics from the data ie across several bias currents Page 44 Integral Solutions Int l October 5 2011 For example 1f Transverse is executed at 0 1mA 0 2mA and 0 3mA and AVG Resistance Ohm result 1s recorded then the statistics are going to be calculated from the AVG column See details below So in this example the SR Sweep will generate the following result If Individual Results option is turned ON then the statistical results presented in bias sweep test would be a copy of what appears in the result With the same data points as above the bias sweep test will generate the following results Resmance compar e m es ns FeenaneeOm0a xu 506 se us This is done so that user can log any results from any test that the SR Sweep module is running When adding SR Sweep test to production only the results selected by user in SR Sweep parameters will appear in production Other results maybe logged with Log Individual Tests option turned on in the Quasi97 gt Data Logging menu Along with bias current user can sweep other custom stress parameters such as field angle static field aux bias and elg bias Simply select the parameter to sweep in the combo box ml SR Sweep 1 Hd Grade Cycles Test Time Test Date Time ParID LR Hdi N A 1 0388 SRSweepl 7 26 201 16 43 44 Operator ID Tester ID Spec ID LotID Comments Fe
99. n a selected field range and reports A as slope User can specify no parameters in which case the slope will be calculated at the Center Sweep range If one parameter 1s set for this function then slope will be calculated on the range Center abs Paraml Center abs Paraml If two parameters are set for this function then slope 1s calculated on the range Center Paraml Center Param2 Slope X Oe The slope result a from doing linear fit on the data Linearity The R result of the linear fitting or the weighted sum of errors Slope Dev Ohm The maximum difference between amplitude and the slope function A H F H in the measurement range Slope Dev at Oe The location where this Slope Dev occurred 29 3 2 At Test The function At Test calculates various TC parameters on a subset range If one parameter is set for this function then slope will be calculated on the range Center abs P Center abs P If two parameters are set for this function then slope is calculated on the range Center P Center P PkPk X Max Min Max X Forward and Reversed curves are averaged Max is the maximum of the A center P and A center P Min X Forward and Reversed curves are averaged Min is the minimum of the A center P and A center P gt Asym X 100 gt Abs Max Ampo Abs Min Ampgo Abs Max Ampo Abs Min Ampgo forward and reverse amplitudes at Center field parameter where Ampois the average for Hyst O
100. n is chosen The head amplitude at From deg field at the end of reverse sweep Page 63 23 5 Example Printout ES angle Transfer 1 Jos Grade Cycles rest Time Test Dae Time PISA N A 5 5 218 Angle Transter 4427200 15 45 55 81 972 277 597 Angle Transfer 1 SE 28 3 45 56 PM Bias 0 31 3470 E Reverse 3 D Ta E E Field Angle ma Clear Resultz Plot Reset Plot Scales Show All Curves e Chart Scale Integral Solutions Int l October 5 2011 Preconditioning Preconditioning stress Options 5weep Cycles 5 From degl 30 Multiple Curves To degjo Reverse TRE Averages 5 Field Oe 200 Inc deg 5 Show uM Results Parameters Grades Fao E Bias Current m 0 314 0 3139 la 3 5 b 45 447 71 A22 47 118 43 Figure 23 2 Angle Transfer Example Page 64 Integral Solutions Int l October 5 2011 24 CMeter Test CMeterApp Application The CMeter test uses capacitor analyzer module on the Gen3B Universal Interface board to measure up to 2 channels capacitance on Piezoelectrical actuator on HSA and HDA The test can be enabled by turning on CMeterApp Application in the Quasi97 Add Ins Selected Modules The CMeter App is included with Quasi97 version 5 0 7 and later CMeter 1 Capacitance Measurement Of x Hd Grade Cycles Test Time Test Date Time Pat D Operator ID Tester ID_ Spec ID LotID Comments E BE tr i
101. ng constant voltage bias and sensing current while sweeping the field The field is swept in forward direction negative to positive and then in reverse direction positive to negative The resultant plot shows the current change at the device vs field lala h Evade Jogos res Time Text Date Tine Pati DperatriD Tester Spee D ron Corren Vl pa Cycles Averages Sweep De 250 Incl oo Fine Sweep Del 00 Fine Incl Amp Uns Ohm e Preconditioning Range u 325 E E Chart Option Ava Curve y es Result Definition 93 459 1 020 Transverse VBias 1 Sub Title Reverse Figure 29 1 Transverse VBias Test The test uses step settle and measure algorithm After setting each field the test waits until the magnetic field is settled and then takes one or several measurements Several measurements at each field are then averaged and placed into raw data table into the Amplitude column The units for the amplitude result are set by the user from several available choices The amplitude can be displayed in the following units uA Ampere 10 is relative to the current sensed at 0 field Amp Amperieid AMP noel uV Volt 109 is uA recalculated to more conventional unit for amplitude using devices resistance In other words this is what the amplitude would be with Ibias equal to the current measured at O field on the device under test This is still a relative unit to the value
102. ng feature is activated by creating a CMeterApp xml file in c program files integral solutions int NExternal Apps If such file is present software will check the selected tester configuration and serial number against the value in the file and if those match apply additional offset to the result to remove parasitic capacitance Below is the example of such file 2 lt Config ConfNumber 1 gt lt SerialNumber gt 0 lt SerialNumber gt 4 CapOffset0 1 123035E 02 CapOffset0 5 CapOffseti 0 6213313 CapOffsetl 6 lt CapOffset2 gt 0 4575147 lt CapOf set2 gt 7 lt CapOffset3 gt 0 548334 lt CapOffset3 gt lt Config gt 9 Config ConfNumber 3 gt 10 lt SerialNumber gt 49 lt SerialNumber gt ial CapOffset0 0 953121 CapOffsetO0 12 CapOffseti 1 51674 CapOffsetil 13 CapOffset2 1 421989 CapOffset2 14 lt CapOffset3 gt 1 374858 lt CapOf set3 gt 15 lt Config 24 4 Cable Offset Normalization File The first time user runs CMeter test on a new tooling the software complains that the cable offset data cannot be found and asks user to zero out the cables User should unplug whatever headstack or HGA is connected and answer yes The new parasitic offsets will be determined and saved into cmeterapp xml file This offset will be subtracted even after software restart as long as tester configuration and tooling serial number does not change If Page 67 Integral Solutions Int l October 5 2011
103. nse probes are connected to a different set of pads from Vbias probes The test adds all three factors that may have been used to recalculate Amp Voltage mV Current uA and 2Pt Resistance Ohm These results are measured at Ooe field Test features selectable measurement range for the 14 bit ADC The smaller the range the better is the resolution Ranges 5 15 50 150 325 are using the low gain mode while 0 05 3 3 are using the high gain mode These modes may be of interest to the user VBias 103 Low gain mode is fairly straight forward the Range must be gt cR VBias 10 100 Rmin For example 10Kohm device with 250mV VBias requires 25uA max current To measure this without saturating the channel user can select low gain ranges of 50 150 or 325 or high gain ranges 0 5 1 5 or 3 3 This may be a little counter intuitive at first as 3 3 selection work ok but 5 or 15 does not work but if the formula listed above is used there should not be any problem selecting the right range Another key factor to consider when choosing one of the high gain ranges is the current difference at Ooe and at user specified field For example if the sensor changes resistance from 10KOhm at Ooe 25uA to 10 5KOhm High magnification on the other hand can be selected such that Range gt Page 72 Integral Solutions Int l October 5 2011 23 8uA at field then the current delta is 1 2uA In this case high gain range of 0 5 is n
104. nsfer Test QPSSplitter Application The test can be enabled by turning on QPSSplitter Application in the Quasi97 gt Add Ins in which case it will appear under QPSSplitter group on the test tree However in case of FMRApp or RIA2008 the test can appear as part of those groups as well Essentially it does not matter where the test appears on the test tree it is just a matter of who will register it first but there is only one algorithm and only one set of parameters in the database Angle Transfer similar to transverse test with one exception instead of sweeping magnitude of the field it sweeps the field angle while keeping the field magnitude the same The sweep parameters are therefore different they include From deg To deg Inc deg Increment plays a bigger role here The sign of the increment dictates which direction the angle will be swept For example in the case of O to 90 degree sweep 50 e increment the sweep will commence counterclockwise 0 5 10 80 85 90 85 80 10 5 0 If Soe increment is used then the sweep will commence clockwise 0 355 350 100 95 90 95 100 350 355 0 It is possible to set up the sweep from Qoe to Voe increment 50e or 5oe which will do full 360 degree sweep anote transtera OOOO ioi xj ha erete oes Tres Te Text pae Tine Trato Torero Tese 1D Tspecio Peor 2 DR HdSZ Passer 0153 Angle Transfer 4 27 200 14 0607 12 2 3 u E Preconattioning Suess Options m
105. ntervals and test duration can be defined Test Time B with Interval B follows Test Time A with Interval A Both Test intervals will be performed at the temperature specified by Test To parameter Pulsed Mode Here the user can define the starting ending and increment temperature as well as the pulse duration The test takes a sample at the base temperature after soaking the head at an increasing peak temperature for a defined duration This is repeated for the user defined range of peak temperatures Sample Temperature Time Figure 20 1 Temperature Sweep Mode O Sample o E gt 5000699000958 EU 3 o Time Figure 20 2 Temperature Constant Mode o O Sample Point E E E E e Time Figure 20 3 Temperature Pulsed Mode Some systems have Lakeshore 340 temperature controller Both models considered equal for this application Page 52 Mode Selection Tabs Averages Run All Selected Heads Temp From C Temp To C Temp Inc C Bias From mA Bias To mA Bias Inc mA Test Time Hrs Test Time B Hrs Sample Time Hrs Sample Time B Hrs Measure O Peak Pulsed Temperature Mode Bias Delay Min Soak Time Min Keep Bias On Integral Solutions Int l October 5 2011 20 1 Setup Parameters These tabs contain the parameters specific to the mode of the Temperature Test Test mode can be selected by clicking on the d
106. ode These modes may be of interest to the user Low gain mode straight forward the Range must be gt RMax Bias 107 RMax IBias 10 E High gain mode on the other hand can be selected such that Range gt This is because the 100 hardware adjusts the center of dynamic range to be O at 0Oe For example 10Kohm device with 50uA Bias setting requires 500mV max voltage To measure this without saturating the channel user can select low gain ranges of 1000 3000 or 6500 or high gain ranges 10 30 or 65 This means ranges 1 3 100 300 cannot be used or the channel will be saturated This may be counter intuitive as 65 selection works but 100 does not work but the formula listed above should help Another key factor to consider when choosing one of the high gain ranges is the current difference at Ooe and at user specified field For example if the sensor changes resistance from 10KOhm at Ooe 500mV to 10 5KOhm 525mV at field then the voltage delta is 25mV In this case high gain range the 10mV is really not suitable but the 30mV and the 65mV still are Page 90 Device IBias uA Cycles Averages Center Oe Sweep Oe Inc Fine Sweep Oe Fine Inc Amp Units Range mV Chart Option Integral Solutions Int l October 5 2011 30 1 Setup Parameters The set of probes to measure on Available choices are Reader Aux ELGA ELGB ELGC ELGD Const
107. oise IBias ELGA AS usos Stress Options Part ID 8 6 Head aROCO Range my 3000 X Axi m le IAS Result Definition Y Axis Ohm v 8 6 D 11 52 28 AM Figure 28 1 DC Noise IBias Test 10012 5 Results Data Parameters Grades 10006 49 10011 91 9997 047 14 The main result of the test 1s the Amp units are selected by the user This 1s the amplitude of the device at the specified field The amplitude can be displayed in the following units uV Volt 10 is relative unit to the value measured at Ooe Amp Amperieid AMP eooe mV Volt 10 is voltage on the device at field Unlike the uV selection the amplitude at Ooe field is not subtracted Ohm Resistance of the device at field The test adds results Voltage mV Current uA and Resistance Ohm These results are measured at Ooe field for reference Test features selectable voltage measurement range for the 14 bit ADC The smaller the range the better is the resolution Ranges 100 6500 are using the low gain mode while 1 6 5 are using the high gain mode These modes may be of interest to the user Low gain mode straight forward the Range must be gt RMax Bias 107 RMax IBias 1073 High gain mode on the other hand can be selected such that Range gt RE This is because the hardware adjusts the center of dynamic range to be O at 0Oe For example 10Kohm device with 50uA Bias setting requires 500mV max voltage
108. oise RMS Max Field 0e LO 00 00 00 00 00 00 o FE CE 01 PS Since ac Noise Count Avg 00 bortis cg ac Noise Count Std 00 ac Noise Count COW 00 AC Noise Test M ja ac Noise Count COD 00 Add Amp At Test uv Avg 14 137 2213 9 22 19 00 00 00 00 1291 oo e J cO eo m o c PS ts ce Fa Fe ce e Clear Results Plot Remove Missing Results _ ares Renove Mising Resuts EEE Figure 18 1 SR Sweep Test This 1s a dual channel test when running in production test 1t will run both channels at a time Both heads connected to two channels will be subject to the same test order With the above setup the test will perform the following steps in production Set ImA bias Select channel O Run AC Noise Test 1 Select channel 1 Run AC noise Test 1 Select channel O Run Transverse gain 3 Select channel 1 Set Bias to 2mA Select channel O Run AC noise Test 1 When running in engineering mode the test runs the same sequence but only on one channel There are two ways to import results from the other tests selectable by individual results per bias option With this option turned ON the module copies individual results from the tests straight into its statistical results If the Individual results per bias option is turned OFF then this module copies the statistics into the data first where each column is a different result and each row is a different bias Then the
109. or Logging is selected Login Parameters Ay Static Tests Sweep Test i Production B 4 Extra HH Write Profile a k R Sampling Test Insert ltem 58 7 uis EE LG Resistance Ohm E X O ee ee ELG Current m ELG Resistance Ohm B 20 Contact Test dog Isolation Test 2 MR Resistance Ohm H i gt lt Electro amp pp Applicatior E MR Voltage my Noise amp pp Application Placeholder DC Noise Lg 2 H E AC Noise Test MM Noise Sweep i Popcom MB MAM Test Eigg S M AN Test a aa SMAN Il Test EE Noise Profile Test E 5 mj Windowed DC No EH Sweep pp Applicatior Br s8module application aa S8Test 4l o Figure 22 3 S8Test Data Logging Example Quasi97 4 5 15 SETUP lt C Documents and Settings ISI Desktop gen3 2 mds gt L B Production 1 Ae Static Tests 1 Test Specific Logging LOG lt C Documents and Settings ISI My Documents abc gt Logging ptions Iv Log Statistics IV Selective Logging IV Use Default System Logging M Use Default Info Parameter Logg IV Use Default Summary Logging Enclose Headers In Guotes Log Raw Data Log Transfer Raw Data Use CSV for Raw Data T Log Raw Results Log Plots Log Individual Tests sub tests Log Parameters in Production F Skip Raw Data in Production Loa Plots in Production 25 File View System Tools Calibrate Add Ins Dia
110. ose three MaxNoiseAmpi Then the tester runs the second part of the test during which it will ignore the threshold and digitize 250uS data Software will use the same Write Delay Read Parameters as in Part 1 however it will modify the number of cycles to get 250uS total read time Here we will calculate NoiseRMS MaxNoiseAmp and the NoiseAmp We then compare MaxNoiseAmp and MaxNoise Amp and report the highest amplitude as MaxNoiseAmp result Page 19 Integral Solutions Int l October 5 2011 For calculating NoiseAmp the software will assume that highest spike for the cycles that were not digitized during first part of the test are NoiseAmp So in our example 1000 If initial threshold is enabled and no data appeared in the first part of the test then the second part of the test SMAN segment will be skipped Equivalent to SMAN test initial threshold does not apply to the very first and the last fields in the field sweep NoiseAmp 7 1 Expected Utilization This test is an improved version of the S M A N and should be used to find heads with field induced instabilities It is able to detect noise glitches that occur less frequently in cases where 250uS read window used in SMAN test is not sufficient Maximum statistical result should be primarily used because the noise glitches can be isolated to one or a few field values 7 2 Setup Parameters Cycles Number of Write Delay Read cycles The test will try to acquire max
111. ot suitable but 1 5 and 3 3 are suitable User can set finite number of samples up to 16000 and sampling rate see Sample Time uS parameter This affects the Amp and Amp RMS results only parameters measured at OField are not affected User can choose to display either the sample number or real time on the X axis Also enabled by default is the calculation of higher order statistics Skewness Kurtosis KSL Calculation of these results 1s somewhat lengthy process so 1f the results are not necessary user can choose to disable them using Results Definition button and reduce the test time 27 1 Setup Parameters Device VBias mV Field Oe Samples Sample Time uS Range uA X Axis Y Axis Stress Options The set of probes to measure on Available choices are Reader Aux ELGA ELGB ELGC ELGD Constant voltage bias to set in the test Note that due to hardware design the voltage at the device will be different from this because of 2Kohm resistance in series with the device under test This is simple voltage divider So for example for 100mV Vbias setting on 50Kohm load will result in 96mV across the device The magnetic field to measure amplitude at Amp Use stress options to set angle if need be Number of amplitude sample to take at the field Up to 255 user can specify any amount if more than 255 1s needed software will automatically round the number to be a multiple of 256 For examp
112. ould not be any problem selecting the right range Another key factor to consider when choosing one of the high gain ranges is the current difference at Voe and at user specified field For example if the sensor changes resistance from 10K Ohm at Ooe 25uA to 10 5KOhm 23 8uA at field then the current delta is 1 2uA In this case high gain range of 0 5 is not suitable but 1 5 and 3 3 are suitable 31 1 Setup Parameters Device Voltage mV Current uA 2Pt Resistance Ohm Resistance Ohm Cycles Averages Center deg Sweep deg Inc The set of probes to measure on Available choices are Reader Aux ELGA ELGB ELGC ELGD The voltage measured across the device before the field is applied typically Ooe This is a direct measurement of voltage drop on the Vsense probe pins The current measured at the device before the field is applied typically Doe VBias 10 Equals to ChannelResistance Current The ChannelResistance is calibrated down to 100 ohm so this result 1s not as accurate as the next Resistance ohm result However this allows measuring device resistance in case of bridge measurement where Vsense pins are placed on a different set of pads than Vsource and isolated through some significant resistance Apt resistance result calculated by dividing voltage sensed by the Voltage 10 Current current sensed The number of times to repeat the angle sweep Depending on
113. p If Fine Sweep is set to 0 then this parameter is discarded The sign of the fine sweep must be the same as the sign of the coarse sweep Option to run reverse sweep Backup option is normally used Mirror 90 runs the sweep in the same direction but with a 90 degree offset For example forward sweep will go from O to 45 degrees while reverse curve will go from 135 to 180 An option to display the results on polar chart Select this option first then run the test Parameter determines units to put on the Y axis as well as the units for the Amp result uA uV mV Ohm and 4Pt mV are available See notes above for details on the calculation User can select one of the gains available in the hardware by using this parameter Ranges 5 15 50 150 325 are using the low gain mode while 0 05 3 3 are using the high gain mode Applies if user specifies more than one cycle Available choices are Avg Curve Multiple Curves and Range Curve Multiple Curves will display amplitude curve per cycle as a separate lines on the plot Avg Curve first averages the data from all cycles and then displays a single curve AMPgyg H Range Curve creates two data columns for amplitude one for maximum and the other for minimum The resultant plot reflects repeatability of the dut at any given field Standard Quasi97 stress option can be applied here including field angle Preconditioning is executed once before test s vbias and
114. ple in this S8Test the user can run one instance or R Sampling test on odd heads and another instance of R Sampling on even heads The test is intended for special built of probe cards where the two channels from QST are connected to 4 heads or 8 heads on a bar instead of typical 2 heads Such probe cards were designed for Gen 3 2xBar interface board where there are 4 possible bias connections on each channel ie Reader Aux ELGA and ELGB The S8Test runs one of the instances of R Sampling test and extracts its results Then the results are displayed with the user defined prefix This is done such that in the case of 4 heads or 8 head connected simultaneously the results will have the same name and can be graded and logged easily For example the reader element of head O 1s connected to CHO Reader and reader element of head 1 is connected to CHO Aux So on head 0 the only tests that are going valid are the tests on the reader whereas on head 1 only the tests on Aux device are valid Consider that R Sampling RD test was created to measure resistance on read channel and R Sampling Aux on the auxiliary channel On the probe card in this example both tests in reality will measure the resistance of the reader element so the results from both tests should be logged in the same column Hence the S8Test where user can add R Sampling RD for head n and R Sampling Aux for head n 1 First test will be executed on even heads and second test on odd hea
115. ple of Result and Printout Hd Grade Cycles Test Time JF ato Pastas est Date Oe ET Integral Solutions Int l October 5 2011 O the standard deviation of noise samples This result tests for normality of noise distribution First the Z score 1s calculated for each noise value using the formula y ATA l O Then the Z scores are sorted from low to high into cumulative fraction plot blue line on the plot below For each point on the cumulative fraction plot the test calculates the probability of the score if it comes from normal distribution x 0 and O 1 red line on the plot below Then at each point the difference from normal probability and actual probability 1s computed green on the plot below KSL result 1s the single maximum difference from this plot es DC Noise Data eu Norm mz delta Amplitude dus DC Noise Curve Sub Tile 30 40 450 60 70 80 90 100 Tinie m Figure 2 1 DC Noise Screenshot Page 9 Integral Solutions Int l October 5 2011 3 AC Noise Test NoiseApp Application The AC Noise test changes magnetic field a 10 Hz triangular waveform and listens for pulses above amplitude threshold through the AC channel The acquisition 1s continuous and amplitude of the head is filtered out AC Channel catches 1Mhz 200Mhz pulses Both magnetic field amplitude and amplitude threshold 1s user defined 3 1 Expected Utilization This test is u
116. plitude in uV Pos Amp uV Positive Amplitude in uV Neg Amp uV Negative Amplitude in uV Asym Asymmetry Page 39 Integral Solutions Int l October 5 2011 16 3 Example of Result and Printout Stable Transfer Function Head Grade Cycles Test Time Test Date JPatID jOperatorID TesterID_____ Comm OC CO ES T EAT Coma E 16 861 38 508 A plitu de S tability Bias 4 999 Part ID Part ID Res Ohm eba V7 e Se OS ET ape Res Ohm 36 83 36 95 36 74 PANAS AA lao a ARA Em GURI RP O EP EO Loe PTA 15 Iterations D e o D 8 gt e E a Y o o D is E E in X Figure 16 1 Stability Test Page 40 Integral Solutions Int l October 5 2011 17 Breakdown Voltage SweepApp Application The test applies constant or ramping bias to the head and monitors various parameters by using other tests such as transverse and SMAN The test is designed to measure the voltage breakdown threshold of the head by using only bias for stress There are two modes of testing Sweep and Cycle Cycle test applies elevated bias to the head for user defined duration and then returns to Test Bias and runs user selected tests This will be repeated for the number of cycles specified by user During the stress interval constant current 1s applied in case of values below 20 If the stress bias 1s above 20 then software considers 1t voltage bias and constantly tries to
117. pp ARA aoc el 42 S 2 ha a ef Start Resistance Ohms 35 348 End Resistance Ohms 35 34594 Resistance Change Dhms 0 002 E A Time uS Reset Plot Scales Clear Results Plot Show All Curves Figure 1 1 Popcorn Test Digitizer Page 6 Integral Solutions Int l October 5 2011 Dix vix eem T REP leet emn Bar 1 Cycles 10000 Popcorn 37 200 11 06 33 Digitizer Popcorn est Al Clear Results Plot Reset Plot Scales Show All Curves Filter F2 0 80 MHz JV Amp Qualify Rate Qualify Preamp Gain 270 Test Mode Popcorn Sweep v Bias On During Write Amp Threshold uv 201 D Write Current m 35 Write us 50 Delay 12 J Multi Events Per Cycle Digitize Pulse Do Not write EXE M Resist t Pre Conditioning Stress Options Iv Ghat Vid End of Test Rate Threshold uv 15 n5 89 8 Frequency Mhz 100 Read 10 Delay fo m Field Parameters Field Oe 150 DC Field C AC Field Sti pespees Ohms End Resistance Ohms 35 e L Resistance Change Ohms 0 036 Figure 1 2 Popcorn Sweep Sample Lyme Parameters Grades y tg ec ee OS p Cycles 1 IP FarsA INS 1 1 23 Popcom 9 17 20011 13 43 Bar FaSR N 1244 Popcom 19 17 200 11 13 39 Bar FaSR N 1 11 223 Popcorn 9 17 200 11 13 26 Bar Popcorn Di
118. rameter determines units to put on the Y axis as well as the units for the Amp result uV mV Ohm are the available choices See notes above for details on the conversion Standard Quasi97 stress option can be applied here including field angle Stress is executed once before test s ibias and fields are set Button opens a menu that allows further customization of results User can enable native results or add custom calculation to be applied to the data The time to wait after setting ibias before taking the first measurement Helps eliminate ibias settling time on larger resistances Page 78 28 2 Results Amp Amp RMS Voltage mV Current uA Resistance Ohm Skewness Kurtosis Integral Solutions Int l October 5 2011 Amplitude of the device at field measured during the test This can be in uV Ohm or mV See description above for more details on the various unit selections Root means square calculation on the amplitude data This 1s useful to gauge the noise of the device when using uV selection The voltage measured across the device before the field 1s applied typically Qoe except if user enables field in stress This is a direct measurement of voltage drop on the Vsense probe pins The current set at the device before the field 1s applied This should match exactly the ibias test parameter 4pt resistance result calculated by dividing voltage sensed on the Vsense pins by the current used in th
119. readjust the voltage across the head to simulate voltage bias as close as possible Sweep test mode is similar to cycle except for each cycle the bias will increased using a fixed increment In this mode the plot will show test results vs the bias voltage The breakdown test can execute up to 5 different tests monitoring up to 3 different results The results can be specified in the Fail on Parameters table Also early abort can be enabled 1f one of the test results exceeds the spec R Sweep Cycle Stress Options Js Stress Option Menu AO EA AA Parameter Value Enable sp Delay mS 10000 Sweep Test Test Bias 1100 rom mV 40 Stress Time s 110 To mV 100 MFR Amp 2 ho mV 5 MFR Res IE Fail On Parameters UE arem 1 I Amp At Test IE V Transverse 1 Resistance Ohms Transverse 1 Asym At Test X Transverse 1 Barkh Jump IE V Transverse 1 Pk Pk Amp uv DORRE Delay mS will delay in the current state for the defined duration Once the duration is passed the next stress item is executed All Items are reset at the end of the test A MA 10S 108 Figure 17 1 Breakdown Voltage Test Algorithm Page 41 Sweep Cycle From mV To mV Inc mV Cycles Bias mV Test Bias Stress Time s MFR Amp MFR Res Fail On Parameters Test Fail On Parameters Result Fail On Parameters Plot Fa
120. rn pulse if Rate Qualify is enabled detected only during first delay period Write Current setting for single Popcorn test non sweep The magnetic field to apply during measurement DC Field will sit at this DC field strength during the test AC Field will be in the form of a triangle wave during the test Number of cycles is modified during the test to run a whole number of AC field cycles Frequency used during write mode in single Popcorn mode non sweep Duration of write Duration of delay During this time only Slope Qualification will detect Popcorn pulses Page 5 Integral Solutions Int l October 5 2011 Read uS Duration of read time for each cycle During this time only amplitude threshold will be used to detect Popcorn pulses Delay uS Second delay applied in between the write delay read cycles The data will not be acquired during this period Multi Events Per Cycle If enabled then each qualifying pulse is counted as popcorn If not enabled then each cycle will count as single Popcorn Pulse if there is one or more qualifying pulses Digitize Pulse If enabled then each cycle with a qualifying pulse is digitized and Measure Resistance at Start and End of Test Sweep Parameters shown on the Digitizer graph Digitizer is significantly slower than popcorn trigger so avoid using it in production Currently the data from the digitizer cannot be logged If enabled the MRR will be measured at the
121. s Backup or Mirror 90 to run the sweep in the same direction but with a 90 degree offset For example forward sweep will go from O to 45 degrees while reverse curve will go from 135 to 180 The options are uV ohm resistance or deltaR R Note that this will only affect the raw data and the plot while the amplitude also Min Max Hysteresis will still be in uV Page 62 23 3 Results 23 4 Bias Current mA Resistance ohm Min uV Max uV Pk Pk Amp uV Hysteresis uV deg Hysteresis Forw From Amp uV Forw To Amp uV Rev To Amp uV Rev From Amp uV Integral Solutions Int l October 5 2011 The bias current that was used during the test The resistance that was measured at the beginning of the test This is the value is measured at Ooe If the show option is set to ohm or then this values is used to recalculate individual data points and whatever is displayed on the plot The minimum amplitude measured during the test The maximum amplitude measured during the test The difference Max uV Min uV The area between the forward and reverse curves The Hysteresis uV deg area under the average forward and reverse curves The amplitude at starting angle at From deg The head amplitude at the To deg angle The head amplitude at the To deg angle when starting the reverse sweep Note that this value will be the same in case of backup option but may differ if mirror 90 optio
122. s are executed after the soak time Defines test mode as described above Length of time in minutes to wait after setting bias before taking the measurement Length of time in minutes where the test will wait after achieving a new temperature before taking a measurement If enabled Bias will remain on for the duration of the test Page 53 Integral Solutions Int l October 5 2011 Bias On During Soak If disabled the bias will be turned off while setting temperature and during the soak time Bias Off at End of Test If enabled the bias will turn off at the end of the test Fail on Parameters Parameters distinguishing a failed part If one part fails and Run All Heads 1s enabled the bias will be turned off for that part and no further measurements for that part will be taken If all enabled parts fail the test will stop 20 2 Example of Result and Printout A Temperature Control Curve Iof x A AP Temp Sweep Pulsed Constant Ramping N 1 0 009 Temperature 02 11 02 4 42 25 PM gt Temp C From 26 Te 30 Inc 11 m Temperature Profile Curve Part ID Head O Le Mode Sweep y Bias Delay Min fo Averages fi Soak Time Min fo v Keep Bias On Bias On During Soak Bias Off at end of Test Run All Selected Heads Asymm X 10 0e Amp uv 10 08 Res Ohm Fail u n Parameters Estemete Enabled Doha Deke Di MaxVeluel Nin Yale Roty Resistance m n 100 Amplitude LI
123. s in the test which allow user to set standard parameters such as field bias write stress and others before running this test Preconditioning runs once before the first capacitance measurement cycle Page 65 Integral Solutions Int l October 5 2011 24 1 Setup Parameters Cycles Delay mS Channel Plot 24 2 Results Unlike other tests the results of this one will appear under STATIC head for HSA HDA tester configurations Capacitance N nF Resistance N nF Number of times to repeat the measurement on selected channels Delay between each cycle This delay does not apply before the first cycle Piezo line to measure capacitance and resistance on Note that to use channel 2 and higher user must have Gen3B HSA or Gen3B HDA front end board User can choose to plot resistance or capacitance on any one channel as a result for this test The capacitance on channel N measured during the test Note that the module may show extremely large capacitance if piezo is shorted to ground The value of 999 999nF is hardware overflow It can occur in case the device is shorted to ground The resistance on channel N The test module will not be able to measure resistance correctly outside of specified range The high resistance values will be trimmed to 200MOhms 24 3 Example Printout OMebler l Capriate Mem Hd Grade Cycles n x Pa JOpersioriD Testes O SpeciD LetiD Comments Cycles 10 Pia E1 iv
124. s should be selected first Then the test results can be added to selective logging and grading In the following table X indicates a unit that user selects Overflow Voltage mV Current uA Resistance Ohm Min X Max X PkPk Amp X Pk Pk Asym Hysteresis Oe X Hysteresis Max Hyst X Max Hyst at Oe Barkh Jump X Barkh Jump Barkh Jump at Oe Delta R R dR Rmin Mean Amp X HOffs Oe 1 if overflow may have occurred otherwise 0 If overflow flag is on then the results should be considered invalid The voltage measured across the device before at the center field This should match ibias setting in the test Apt resistance result calculated by dividing voltage drop across Voltage 10 Current Vsense pins by the ibias Minimum amplitude measured Forward and Reverse sweeps are averaged and then minimum is found on the resultant curve Maximum amplitude measured Forward and Reverse sweeps are averaged and then maximum is found on the resultant curve Max Min 100 gt Abs Max Ampo Abs Min Ampg Abs Max Ampo Abs Min Ampgo forward and reverse amplitudes at Center field parameter where Ampois the average for A center sweep Abs F H R H dH where F H is amplitude on the forward sweep and R H is the amplitude on the reverse sweep center sweep F H R H 100 Hysteresis 2 center sweep
125. s that are going to be generated by these 30 3 1 Slope Performs a linear fit of F H aH b on a selected field range and reports A as slope User can specify no parameters in which case the slope will be calculated at the Center Sweep range If one parameter 1s set for this function then slope will be calculated on the range Center abs Paraml Center abs Paraml If two parameters are set for this function then slope 1s calculated on the range Center Param1 Center Param2 Slope X Oe The slope result a from doing linear fit on the data Linearity The R result of the linear fitting or the weighted sum of errors Slope Dev Ohm The maximum difference between amplitude and the slope function A H F H in the measurement range Slope Dev at Oe The location where this Slope Dev occurred 30 3 2 At Test The function At Test calculates various TC parameters on a subset range If one parameter is set for this function then slope will be calculated on the range Center abs P Center abs P If two parameters are set for this function then slope is calculated on the range Center P Center P PkPk X Max Min Max X Forward and Reversed curves are averaged Max is the maximum of the A center P and A center P Min X Forward and Reversed curves are averaged Min is the minimum of the A center P and A center P Asym X 100 gt Abs Max Ampo Abs Min Ampgo Abs Max Ampo Abs Min Ampg forward
126. se Me 4 264 0152 4264 4 156 Peak Noise Amp Max Fi 20 Field Oe Patent Pending Reset Plot Scales Show All Curves Noise Profile Test 1 Hd Grade Cycles Test Time Test Time PatlD Operator ID Tester ID Spec ID Lot LBISR3 NA 2 0 1 375 Noise Profile Te 10 16 216 35 15 ParD OperatodD TesteiD Filter F1 0 30 MHz wi 20 20 Gain 2825 Cycles 2 Threshold uv 50 Fixed Field From Field Del 20 To Field 0e 20 Inc Field Dejfto Y Enable Early Abort on Max Error Count Max Error Count fi 0 Amplitude vs Field Digitized Data 1 345 60 Pre Conditioning E 5 783 Noise Profile Test Digitizer Field Oe 20 Time uS 2160 Peak Amplitude uV 55 84121 20 Do 1 977 60 2 054 40 161 46261 20 00 1 996 80 55 84121 47 05323 2 080 00 2115 20 71 71526 52 31188 2147 20 2 160 00 29H12 PO AR L1 43 7453 55 84121 Speed Control Faster Slower uL LL PARI Amplitude uv 0 5 0 6 Time uS Clear Results Plot Reset Plot Scales Show All Curves Average Peak Noise p 55 55 55 843 0 562 55 843 Nowe qna a BI oat bist bee RN E Noise Count 2096 0 21320 760 21 32 0 e 0 Noise Percentage Z 4 192 4 156 4 264 0 152 5 a Average Peak Noise Me 20 Peak Noise Amp Max Fi 20 2 Figure 9 2 Noise Profile Test Results Page 27 Integral Solutions Int l October 5 2011
127. se Test is used to discover DC instabilities in the reader These instabilities are often seen as Baseline Shifts in other tests 2 2 Setup Parameters Samples Amount of samples to be acquired during the test Control the duration of the test and the number of data points Maximum number of samples is 16381 Field Oe QST will set this DC field at the beginning of the test Sampling Rate The frequency of the measurement controls how many amplitude samples per second to acquire 2 3 Results Amp uV Head Amplitude Note that average result is the actual amplitude of the head at the field specified in parameters for this test Other statistical results such as range std and others may be more useful to describe the noise measured by this test Bias Current mA Bias current measured at the beginning of the test Amp RMS uV Measured Amplitude RMS Skewness The result shows the degree of asymmetry of distribution around its mean The exact formula is sn AP f oe O Where N number of data points X the noise amplitudes shown on the plot X the mean noise amplitude O the standard deviation of noise samples Kurtosis The result shows the relative flatness of distribution relative to standard distribution The exact formula 1s l v x x i s 3 O Where N number of data points X the noise amplitudes shown on the plot X the mean noise amplitude Page 8 KSL 2 4 Exam
128. sed to measure AC instabilities in GMR heads that occur at certain fields These instabilities can sometimes be seen as Barkhausen jumps and or kinks on a transfer curve The AC Noise Test is generally set up in such a way that non zero counts are considered failures During the test MR element is exercised by cycling the magnetic field continuously for one entire period just like Transfer Curve At certain magnetic fields an unstable MR will produce a series of noise pulses with bandwidth measured between 20 100Mhz By measuring the number of noise pulses through a high frequency channel the effect of the very low frequency magnetic field is filtered out leaving only the noise pulses themselves Using a Threshold Qualifier on these AC noise pulses the number of pulses is counted during the test Thresholds of 100 200uV are typical or about 2x 3x higher than the baseline noise If the instability region spans only a small range of magnetic fields this is a lower probability noise event and appears as a Hard Kink in the Transfer Curve and the resulting number of AC Noise counts will be relatively small If the instability region spans over a large range of magnetic fields for example 100 then this higher probability event will appear as a Soft Kink in the Transfer Curve and result in a high number of AC Noise counts An ideal head will have neither Hard nor Soft Kinks with a resulting AC Noise count of 0 dependent on the Threshold used Page 10
129. ss Options Result Definitions 1 Point Delay mS The set of probes to measure on Available choices are Reader Aux ELGA ELGB ELGC ELGD Constant current bias to set on the device for the test If device changes resistance voltage across the device will change but current will remain at this level The magnetic field to measure amplitude at Amp Use stress options to set field angle if need be Number of amplitude sample to take at the field Up to 255 user can specify any amount if more than 255 is needed software will automatically round the number to be a multiple of 256 For example if user sets 300 software will change the setting to 512 This is an inverse of the sampling rate to use The minimum is 0 1us 10MHz and the maximum is 25 5uS 40KHz The DC channel has 7KHz low pass filtering so main purpose for this setting is to complement Samples parameter to define the sampling interval User can select one of the gains available in the hardware by using this parameter Ranges 1 3 10 30 and 65 are using the high gain mode while 100 300 1000 3000 and 6500 are using the low gain mode Parameter determines which units to put on the X axis Sample Number and Time mS are available for user to select Values can also be plotted vs Field but currently the test does not allow setting more than one field so if this option is selected then all the points are stacked together at a single X position Pa
130. st Time Test Date Time PartID_ Operator ID Tester ID_ Spec ID Lot LR SR3 N A 12 11 375 Noise Profile Te 10 16 2016 35 15 PartlD OperatoiD TesteriD Amplitude vs Field Digitized Data Noise Profile Test Noise Amplitude Part ID PartID Head SR 3 21 360 74 563 Integral Solutions Int l October 5 2011 Filter F1 0 30 MHz y Gain 2825 Cycles 2 Threshold uv so Fixed Field From Field De 20 To Field De 20 Inc Field Delfio IV Enable Early Abort on Max Error Count Pre Conditioning Max Error Count fro Digitized Pulses E Pulse for display Field De Time US Pesk Anel LA Cida E T2000 48 o 48 EE 20 00 67 20 68 78593 20 00 96 00 64 62919 La Ca 20 00 Average Peak Noise pY Noise Sigma uv 15 Peak Noise uv 20 00 0 40 208 00 54 13929 55 84121 20 00 236 80 54 37655 20 00 O a a Ll mt Ey Results Average Peak Noise pl Noise Sigma y V Peak Noise y V Noise uv 278 40 Start Slideshow Slideshow Speed Control 160 2352 7h AQTOR Faster gt Slower Parameters Grades ET Max Range Field31 Field 22 Fie 3 55 5 858 76 545 55 843 0 562 6 154 0 84 79 276 7 323 Res Field De 200 400 m 10 5958 15 77574 76 346 Noise Count 2036 0 21320 76 0 2132 0 2078 0 4 192 20 Noise Percentage Average Peak Noi
131. stance 10 xi Tas Tide Toi eae et Jose True Pant sean Tener 10 pe ao Temen DevicelELGA VBias mvjfio0 DlHaT N A 1 172 DC Nose veia 9 9 20117 2127 OOO Field De 300 T e c r 024 me DC Noise VBias Sango Tio os e ves Options Pat ID Head Hd 1 Range 4 u4 15 A Axis Samplet y 5 21 27 PM YArs orm 7l Result Definition 0 1100 Results Data Parameters Grades Result 0 1075 mp Ohm LI Amp RMS Ohm 0 1 Voltage mV 0 0 Current 4 0 0 0 1050 2Pt Resistance Ohm O Cbaumana n nnn Figure 27 1 DC Noise VBias Test The main result of the test 1s the Amp units are selected by the user This 1s the amplitude of the device at the specified field The amplitude can be displayed in the following units UA Ampere 10 is relative to the current sensed at O field Amp AmPeriela AMP oce uV Volt 10 is uA recalculated to more conventional unit for amplitude using devices resistance In other words this is what the amplitude would be with Ibias equal to the current measured at O field on the device under test This is still a relative unit to the value measured at Ooe mV Volt 10 is absolute voltage on the device This 1s recalculated using current and resistance measured at Ooe field Ohm Resistance of the device at field 4PtmV True voltage across the device measured at field Use this if need be in the applications where Vse
132. sverse Bias ELGB Fine Sweep Dell Fine IneJ0 5 Bias Part ID abc 91 Head 0 1 CR1C3 Range miv 65 zl Preconditioning i E a Unit ns El Stress Forward Reverse Chart Option Multiple Curves Result Definition 120 aer Laer E LT NN TS 110 Overflow 0 0 0 0 IRI Voltage my 189 969 189 969 189 969 Current u amp 1 0 1 0 1 0 100 Resistance Ohm 189968 90 189968 90 189968 91 f Min rnv 6 1 6 1 6 1 90 d Max mV 126 593 126 593 126 593 Pk Pk Amp mv 120 493 120 493 120 493 Pk Pk Asym 5 52 52 52 52 52 52 30 Hysteresis De mv 5858 0 58580 5858 0 Hysteresis 18 966 18 966 18 966 Max Hyst mV 43 689 43689 43 689 gt 70 Max Hyst at De 30 94 30 94 30 94 E Barkh Jump mV aze 1 376 1376 o Barkh Jump 2 1 142 1 142 1 142 60 Barkh Jump at De 4 951 4 951 4 951 E j Delta R R 0 063 0 063 0 063 dR Amin 5 1975 389 1975 389 1975 389 50 Mean Amp mV 66 346 66 346 66 346 Hoffs Oe 35 466 35 466 35 466 Hc De 21 935 21 935 21 935 40 Fine Slope m e 0 956 0 856 0 856 Fine Linearity 30 Fine Slope Dev my Fine Slope Dev at De Fine Max mi 20 Fine Min mi L Fine Asym 7 10 P d Fine Hyst De mw po Fine Hyst 2 TT tl ty ne es T Fine Barkh Jump 300 250 200 150 100 50 D 50 100 150 200 250 300 Fine Barkh Jump at Oe 1 1 Fine Delta R R Magnetic Field Oe Fine HcMas De Clear Results Plot Reset Plot Scales Show All Curv
133. t Plot Scales Show All Curves 72720 040 Figure 31 3 Angle Transfer Example 2 Page 102
134. t mV O esistance Ohms lope pV 0e O D D KIK Ogos OOO cco K 8 T RS ER 8 1 8 8 E E E RI oo Remove Missing Results ER Figure 18 4 SR Sweep Test Example 1 a SR Sweep 1 in ES Hd Grade Cycles Test Time Test_ Date Time Pat D OperateriD TesterID SpecID Lot D Comments Fail Code Data Hd O O EA ULOE E R HdO Passei 2082 SRSweep 1 4 9 200 16 27 48 Co Mo o 5893 08 rs DE Parameters Grades Bias ici 0 1 0 3 0 1 CET EEE A ES Tum Discrete 0 1 100 125 Amp At Test pV 01 13523 2213 8 31698 0 61 Ee PE Vv Min uly 0 1 3572 33 68 0 e ala Pk Pk Amp uv 0 1 65 198 72 886 59 798 3 088 12 320 ce o e Milo PkPkAsym Z 01 9 833 565 1264 AC Noise Test oise Count 0 1 E WR Rec Test M d 37297 i D mp At Test pV 100 0 5 0 k Pk Amp uv 100 i Ang COV COD Std Missing f 4 k Pk Asym 100 7 443 31 13 36 67 7 8 DIO esistance Ohms 100 305 08 305 09 305 09 oise Count 100 pp D zz no Pio tv ge a S ci AM 5 az 9 Resut fo Max Slope Signed De Max Slope Amp pV reamp Amp At Test mM esistance Ohms lope py 0e z inmumuzrm m 3 TD g lt p s c 0 8 85 10651 0 651 0 651 12907 2213 184 2023 102698 0 796 0 089 63 303 02 TD Do T o lt E lt 3 m m 0 5 n3 a mp At Test i V 125 k P
135. te Add Ins Diagnostics Help y Transverse 1 de Available Modules Static Tests 1 EE W R Rec Test 1 B Production 1 y Popcorn 1 Meter 3 po Selected Modules Im Peripherals Handler Hid Grade Cycles T MAR Date Time PartID Operator ID Tester ID SpecID LotID ono bo Add Remove Comments 24 Quasi 97 Static N A 10 13883 CMelerT 7 8 201111 0215 Cycles 10 Plot C1 nF Delay mS o Y Transverse m CMeterApp Diagnostics Cap Hex Cap Res Hex Res Cable Offs TOT CH 1 FFFF FFFF Tes FFFFFF Te 0 953121 C Gain 7 71219 Cap offs 517 542 CH 2 Text1 Text Tet Text 1 51674 R Gaini Rois D DivbC cH3 redn reu reu rei 1 421383 CH4 Text Tet Text Text 1 374858 ane CH5 Text Text Text Text E Label Addr Mask Operation Hex Value For _Setup Default m x asa EN fas FF write fFF 255 E 4 1 f iP Pat Pe eke 24 5 Hardware Diagnostics Menu Page 68 Integral Solutions Int l October 5 2011 25 CMeter Hd Test CMeterApp Application The CMeter Hd test 1s a companion module for CMeter Test for non HSA testing HGA Bar and others It also uses capacitor analyzer module on the Gen3B Universal Interface board but measures on the single channel which depends on the head selected by the user The test can be enabled by turning on CMeterApp Application in the Quasi97 gt
136. te current read bias etc to find specific areas where the head is most susceptible to popcorn 1 1 Setup Parameters Cycles Amp Qualify Rate Qualify Filter Preamp Gain Test Mode Amp Threshold uV Rate Threshold u V nS Write Current mV Field Oe Field Type Frequency MHz Write uS Delay uS Number of iterations the write delay read delay sequence will be run If AC Field is enabled this parameter will be increased to include a whole number of magnetic waveforms the frequency of AC field is 10Hz If enabled the user can define a threshold in u V that will be considered a Popcorn pulse This detection only occurs during the Read period If enabled the user can define a slope in uV nS that will be considered a Popcorn Pulse This detection only occurs during the Delay period Which filter to use F1 or F2 These filters are user defined as placed on the Universal Interface Board of the QST Usually Fl is 30Mhz and F2 is 80 Mhz The gain programmed for the read channel preamp chip read only Popcorn runs popcorn sequence n number of cycles Popcorn Sweep reruns popcorn sequence n number of cycles at each Amplitude Threshold Write Frequency Read Bias Write Current or Set Register values defined in sweep parameters Threshold that will be used to detect popcorn pulses during read period if Amp Qualify is enabled Slope of write to read recover that will be considered a Popco
137. the voltage or cycle at which this parameter failed the limits If the test was not aborted on fail on parameters then the result will show N A The voltage at which the amplitude exceeded MFR Amp The voltage at which the resistance exceeded MFR Res The ratio between voltages where amplitude failed MFR Amp and resistance failed MFR Res R MFR MFR 100 M Resistance Currently 1s set to Completed all the time 17 4 Example of Result and Printout BreakDown Voltage uia THIER de pa 58 45 jura EXC sae DELTA sf 4 HA k mi ml Y rei mi ml hryAMG Amp Test uv AM y LF Agen AL Test IM Resistance Se re Tes Te Break Down Voltage Tests Stats Bias 1 28 Part ID PartID Head SR 46 Fui aj BreahDown va SA Ske PaHD Ope Tester E Sweep E pela Suess Opora Hrem Wed T TASE P Upmali TesenD E Aa E reader Vol MT 14 SD Pal pD Testa NE j tree Tes Tetas roo Ersan Val Tova 14 434 Pai pesto TeaterlD tho oe fi Brenain Voll a AA 1 Fail lipsa Tester From ni uo Cycler Stress Time et 1 BreakDown Vol VIVA 14 4858 PatiD Opel Tesei teja i0 mama lnc int MEA Amp XE ro 5 MFR Res tsk fT Aap A Test la Ti mimsita 1 Fletistance bina EA Ti mimsita 1 js At Taat c IL Raro Jure uv m ri Stress Voltage mV Fleset Plot
138. tion Test Page 34 Integral Solutions Int l October 5 2011 13 Bias Angle SweepApp Application Bias Angle test runs transfer curves using different bias current in the user defined range Transfer curves will be run at maximum magnetic fields in order to saturate the head and the best bias current will be calculated 13 1 Setup Parameters The setup parameters for the Bias Angle Test are as follows Cycles Number of iterations entire test will be run Averages Number of averages per each point measured Sweep From mA Starting bias current in m Sweep To mA Ending bias current in mA Sweep Inc mA Amount to increment bias current in mA 13 2 Results Optimal Bias Bias calculated to be optimal for this head Optimization is calculated based on head type AMR or GMR 13 3 Example of Result and Printout BiasAng Transfer Function Head Grade Cycles Test Time_ Test_______ Date__ Pat D OperatorID TestrlD Com 4 BE N 1 300 059 Bias Angle 8 19 99 2 55 47 PM Part ID Operator ID Tester ID Cornrr Cycles 1 11 39 111 Bias ngle 8 19 99 2 50 15 PM Part ID Operator ID Tester ID Comer re Bo 4 742 53 566 Bias Angl e Pl ot Sweep From m 2 Part ID Part ID Sweep To m fio Sweep Inc m 0 5 Results Parame Grades Optimum Bias m 6 0 o q a v 2 45 ES in G tt 6 Bias Current mA Clear Results Plot Reset Plot Scales Show All Curves
139. ult from fitting on the forward sweep curve HSat Rev Oe Hsat result from fitting on the reverse sweep curve HSat Avg Oe Forward and Reverse sweeps are averaged The HSat AVG 1s the result from the fitting done on the average curve HSat Avg Fit The R of the HSat Avg 29 3 5 CycleRep The function CycleRep helps determine amplitude repeatability at each field This function is only available when user runs 2 or more cycles At each field step function calculates the minimum and maximum value across multiple cycles and then reports the max single point out of this new curve If one parameter is set for this function then slope will be calculated on the range Center abs P Center abs P If two parameters are set for this function then slope is calculated on the range Center P Center P gt Max Var Forw X Maximum variation at a single field on the forward sweep across several cycles MAX center sp MAX Et F H MINE F A H center P Max Var Forw at Oe Field location where Max Var Forw occurs Page 87 Integral Solutions Int l October 5 2011 Max Var Rev X Maximum variation at a single field on the reverse sweep across several cycles MAX conver 2 MAX C R H MINEZ R H H center P Max Var Rev at Oe Field location where Max Var Rev occurs 29 3 6 Max Slope The max slope function calculates slopes in small intervals user defined width using a sliding window the step 1s also
140. will keep running after MER Res is reached The test to be executed during between the stress intervals Results from this test will be monitored The result from the test selected which should be monitored and charted Turns on off plotting of this result on the breakdown voltage test chart control If turned ON this result will be checked before each stress interval against the user specified limits If the result should fail then the test is stopped Signed percentage change from the first data point which should stop the test The minimum value for this result If the result measured is less than this value the test is going to be stopped The maximum value for this result If the result measured is bigger than this value the test is going to be stopped The statistical result to be extracted from this test Page 42 17 3 Results Integral Solutions Int l October 5 2011 The test is going to capture results from other tests and save them under the data tab raw data for breakdown Bias Current mA Amb Temp C Stress Time sec Fail Point MFR Amp mV MFR Res mV MFR Result voltage test At the end of the breakdown test the breakdown voltage results will be calculated The bias current used during the test The ambient temperature measured during the test The stress interval in seconds used during the test If the test was aborted due to Fail On Parameter then this result will tell

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