Ossila Multifunctional PV/OLED Measurement System User Manual
Contents
1. 48 Ossila Ltd User manual Version 2 Copyright 2009 2015 3 enabling innovative electronics Overview The versatile Ossila USB test board allows automatic testing and measurement of multi pixel OLEDs and PVs substrates to help make research and development faster easier and cost efficient It comprises a main board multiplexor and one or more interchangeable substrate boards The main board allows computer controlled multiplexing of eight individual signal lines With each line connected to a specific pixel connector on the interchangeable board a variety of substrate geometries can be easily characterised by simply connecting the appropriate test board to the Ossila multiplexor The standard Ossila boards are also fitted with a reference thermometer and photodiode to allow automatic tracking of the environmental conditions during measurement Computer control of the switching is provided by a National Instruments USB interface card to make programming easy in a variety of languages such as LabVIEW and MATLAB Additional features include a cooling fan to keep substrate temperatures stable under high illumination a TTL control for external systems such as the shutter of solar simulators and finally the possibility of connecting an external photodiode for OLED photocurrent characterisation All of these features can be controlled automatically by the multiplexor The versatility of the system makes2. IMPP VMPP Pin Pr Aeff Pm Eq 4 with Aeff is the effective area given by the product of the pixel area A and Example Let us suppose that A 0 0212 cm and 0 9 Sun The value of the source attenuation factor is the 0 9 and the effective area is Aeff 0 9 0212 0 01908 Note The photodiode measures a current of approximately 1 mA Pin 1 Sun Ossila Ltd User manual Version 2 Copyright 2009 2015 30 enabling innovative electronics 400 Voltage V Figure 3 JV Sweep with max power point Pmax open circuit voltage Voc and short circuit density of current Jsc Ossila Ltd User manual Version 2 Copyright 2009 2015 31 enabling innovative electronics Main UI Controls DOR Run starts an acquisition session by running the committed experiment in memory Add Setting is used to enter a new experiment setting Refer to the section Quick Start for a detailed explanation on how to specify a new experiment setting i Del Settings allows the user to delete an existing saved experiment setting ems To delete an experiment 1 Click on Del Settings 2 Onthe List of Saved Experiment UI select the experiment to delete and press the Delete button See Setting opens the current experiment setting Tip Use See Setting to modify an existing experiment or to save a new experiment that is similar to an existing
3. Acquisition Settings SMU Settings Samples To Avg PLC Power Line Cycle specifies frequency of the electric power grid 50 or 60 Hz Keithley 26XX series automatically detected the PLC of the power supply grid Aperture Time Power Line Cycle is the oscillation frequency of the AC current supplied to the end users through the electrical power grid In the EU Australia part of Japan and several other countries the PLC is 50 Hz with a voltage range of 220 240 V In USA Canada and Taiwan part of Japan etc the PLC is 60 Hz with a voltage range of 100 120 V Ossila Ltd User manual Version 2 Copyright 2009 2015 33 enabling innovative electronics Note Providing the correct PLC is detected set SMU are usually equipped with built in filter capable of rejecting the noise originated from the oscillatory behaviour of the power supply This SMU capability is often referred to as PLC noise rejection Sample to Avg specifies the number of current readings that the SMU requires to output a single measurement point For example if Sample to Avg is set to N the SMU takes N independent measurements which are then averaged so that a single averaged output is returned Increasing N will increase accuracy at the cost of measurement speed N 1 is usually adequate unless stringent accuracy requirements or specific measurement needs require larger data sample Refer to the SMU user s manual for the maximum numbe
4. 4 Network Devices Scales Software VI Drivers Remote Systems Vendor Model Serial Number Firmware Revision Status VISA Resource Name Keithley Instruments Inc Model 26128 4071675 304 Present GP1B0 26 INSTR gt 2 Settings a Attributes 2 VISA Properties Figure 2 MAX Measurement amp Automation Explorer user interface Ossila Ltd User manual Version 2 P Rename my resource P Communicate with my resource P View and edit properties for my resource GPIB Instrument Settings This section provides basic information about your instrument such as Primary Address PAD Secondary Address SAD and response to the IDN query Copyright 2009 2015 23 enabling innovative electronics Operation amp Acquisition Mode Easy JV Sweep can automatically acquire JV JVL curves of a multi device substrate by switching over the different channels of a multiplexor Since each multiplexor channel is associated connected to a different device on the substrates through the cathode and anode POGOs mounted on the interchangeable board see Board Layouts the DUTs can be automatically characterised by selectively turning ON OFF these channels Refer to the Sec Quick Start for more details on how to set up an automatic acquisition Important The Ossila multiplexor USB1 must be connected to the host PC via a USB cable otherwise error code 5040 will be returned and
5. Ossila Ltd User manual Version 2 Copyright 2009 2015 29 enabling innovative electronics OPV PV Figures of merit The main figure of merit of a solar cell is the power conversion efficiency PCE defined as the ratio between Pout the cell output power and Pj the input power sun or artificial light namely n Pout _ Voc Pm Pin Pin Eq 3 In Eq 3 Jupp and are the J V current and voltage at the maximum power point Pmax with Jupp density of current mA cm and A area of pixel or area of the aperture of measurement mask The maximum power point can be written as the product of the Fill Factor FF Short Circuit current density and Open Circuit voltage Voc see Eq 3 and figure 5 below Easy JV Sweep automatically calculates the power conversion efficiency as the percentage of power out versus power in i e PCE 1 100 PCE together with Jupp FF Jsc Voc are the figures of merit that Easy JV Sweep returns for each DUT Important The is calculated under the assumption the power of the light source Pn is equal to 1 Sun If P less than 1 Sun the actual value of the input power can be taken into account by inputting an effective device area in the Dev Area control on the Experiment Settings UI Demonstration If Pj is the actual input power with O lt lt 1 attenuation factor of the light source then we can write Pout _
6. and Rm are different from zero a constant voltage Vo applied at time t 0 will not instantaneously transfer to the DUM but it will instead be governed by the following equation t 1 m 1 where Vpyy t is the voltage at the DUM at a time t with R Rm and Cpum total resistance and capacitance of the measurement apparatus and DUM RC has the unit of measure of time and is usually indicated as the time constant t of the system t RC If a voltage Vo is applied at t 0 Vpum T 0 63 Vo Therefore for each acquired data point Delay must be 9 10 time larger than the time constant RC For Ossila PV OLED measurement system with two meter long BNC cable typical value of resistance and capacitance R 0 2 and 250 pF which gives negligible time constant Usually a settling time ranging from one to 10 ms is adopted to allow the discharge of the initial stray capacitive current i e the tiny current that arises from the discharge of the capacitive components of the system DUT Board Cable SMU we assume that the resistance and capacitance elements of both DUM and measurement apparatus are in series and parallel respectively Ossila Ltd User manual Version 2 Copyright 2009 2015 48
7. Application and Global Settings and Experiment Settings UI 11 On Experiment Settings UI hit the Commit button to commit the experiment 12 On the main UI hit Run to initiate the acquisition Important You can stop and start a lifetime experiment through the STOP and Run command on the main UI If you stop a lifetime experiment this will remain committed even if the application is closed The lifetime can therefore be restarted by hitting Run on the main UI Conversely if a different experiment is committed the lifetime experiment must be reloaded in memory see instructions 10 to 12 above Lifetime Logging Tree Structure Lifetime data is organized and stored in the data storage volume according to the following logging tree structure Volume LifeTime_Ossila_MB SweepType ExpName FileName DataFiles Ossila Ltd User manual Version 2 Copyright 2009 2015 36 enabling innovative electronics Volume is the user selected disk partition disk volume see instruction 2 above LifeTime_Ossila_MB is the master directory containing the entirety of the Lifetime data saved in Volume LifeTime_Ossila_MB is automatically created whenever the user chooses a different data storage volume SweepType directory is used to organise the PV OPV and LED OLED measurement in two separate groups SweepType JV or JVL depending if the DUT is a solar cell or light emitting diode respectively ExpName and FileName directories are the experi
8. Vena AV etc while the second records the JV sweep one per DUT Finally the third one contains the solar cell figures of merit such as PCE FF etc and the environmental sensor data photodiode and temperature sensor Easy JV Sweep organises the data file according to a data logging tree structure which in case of finite single measurement mode reads as follows C Users Pier Desktop ExpName FileName where C Users Pier Desktop is the path to an existing master storage folder computer Desktop in this example that the user select through the Data Folder Path control on the Experiment Settings Ul ExpName and FileName are the experiment and file name entered in the corresponding input fields on the same UI Refer to Lifetime Logging Tree Structure for more information JVL acquisition Similarly to OPV PV measurements light emitting diode data JVL sweeps are grouped and stored in four data files one per acquisition session 1 Y_M_D hh_mm_ss _ FileName Header 2 Y_M_D hh_mm_ss _ FileName Sweep 3 Y M D hh mm ss FileName JL Sweep 4 Y M D hh mm ss FileName Efficacy with Y M D hh_mm_ss timestamp see JV acquisition section above The first file Header contains the JVL settings the second JV Sweep and the third JL Sweep stores the driving voltage Vs current and the driving voltage Vs photocurrent of the DUTS respectively The last file Efficacy contains the ratio between the photocurrent and the driving current
9. running a self test and or reset If the hardware is properly connected check whether the alias names USB1 are properly assign to the equipment Easy JV Sweep opens but it returns the error message 5041 Action Check the GBIP connection with the SMU Make sure that the Keithley is switched on You can use MAX Measurement amp Automation explorer to check whether the GBIP can see the SMU by right clicking on GBIP under Devices and Interfaces in MAX and then choosing Locate Device on the right side panel of MAX NI SMUs appears under Devices and Interfaces nested under Chassis Note If the SMI is an NI PXI you may need to reboot the computer after turning on the chassis If the hardware is properly connected check whether the alias names KeithleyO or SMU and SMUB for NI PXI are properly assigned to the equipment Easy JV Sweep returns an error when loading previously saved experiment settings For each saved experiment say ExpNme Easy JV Sweep stores the setting in an XML file called ExpName An error can occur if the settings file is corrupt or not present Action If an error occurs when loading ExpName navigate to the data folder located at C Programme Files 86X Easy JV Sweep data the actual path depends on where the Application is saved locate the file ExpName and delete it if present Open the file ListConfFiles with MS NotepadO this file contains a list of the saved user s experiments and delete the ExpName entry
10. 5 mA with 2 0 V external pull up resistor The total current sourced by all DO lines simultaneously should not exceed 65 mA Ossila Ltd User manual Version 2 Copyright 2009 2015 12 enabling innovative electronics System Specifications The OPV system is highly specified to introduce the minimum amount of distortion in the measurement as possible The resistance introduced in each pixel path is lt 0 2 leakage noise current is lt 30 pA and capacitance is lt 350 pF Typical values for the OPV system with an interchangable board are shown below e DC pixel current typ 0 100 mA max 1 A e Pixel voltage range typ 20V to 20V max 100V to 100V e On state resistance typ 0 1 max 0 2 e Capacitance per pixel lt 350 pF e Leakage noise current lt 30 pA Typical values for the OPV system with an interchangeable board attached Leakage at 10V Capacitance Absolute Maximum Ratings DC pixel current 1 A One pixel at a time Pixel voltage range 100V to 100V Shutter output current 2 mA Digital 1 0 header pin current 2 mA Power Adapter 12VDC connector Output current 330mA External BNC current 0 5 A DC Digital I O voltage range 0 5 to 5 8 V with respect to GND Ossila Ltd User manual Version 2 Copyright O 2009 2015 283 pF 284 pF 269 pF 256 pF 304 pF 294 pf 263 pF 241 pF 13 enabling innovative electronics Electronic Switch Specificat
11. Cannot select the pixels or other functions Action Check if the Error LED is on If the Error LED is on set the security bits Check the interchangeable board has been connected properly to the main board Misconnection may cause a short causing a complete malfunction of the board Remove and reconnect Check the M6 screws washers are present on the board If not and the board is sitting ona conductive surface it may short the pins on the reverse side of the board e All the LEDs on the OPV OLED Test Board are off Action Check the LED swich is refer to Board Layout e The shutter does not work Action Check your shutter opens when a LOW signal is applied to it through the shutter BNC cable and closes when a high signal is applied Ossila Ltd User manual Version 2 Copyright 2009 2015 45 enabling innovative electronics Guide to the Reader Symbols Acronyms Common Definitions In this User manual the device or substrate that is being measured characterised will be referred to as Device Under Test DUT The equipment that is driving controlling and measuring the output of the DUT is the Source Measurement Unit SMU The SMU drives the DUT by providing an increasing voltage or current to the DUT source function and reading the output measurement function The reading is usually taken after a delay time At called settling time or dwell time has elapsed The delay is introduced to take into account the time required
12. ExpName SettingsPath C Users Pier Desktop Easy JV Sweep Multiplexer Settings ExpName StartTime TagNumber 0 Date 3509967632 821051 Date 24 12 201412 23 Note with this action ExpName e settings are permanently deleted Close the file restart Easy JV Sweep and try to load a different experiment If the problem persists contact technical support at info ossila com Easy JV Sweeps it performs the measurement cycle the output is constituted by noise current 1 Power plug is not connected Action Required connect the power plug to the 12 V socket on the board 2 The push fit connector of the test board is not present or not properly fitted Ossila Ltd User manual Version 2 Copyright O 2009 2015 43 enabling innovative electronics Ossila Ltd 3 Action Required Make sure that the push fit connector is tightly arranged on the top of the test board The coaxial cables connecting the SMU are not properly connected Action Required Switch OFF the SMU and check the connections Make sure that the Front Panel I O PXI connectors Backshell are both tightly plugged to the receptacles and that the WARNING label is on right side of the I O Backshell If the problem persists unplug the Backshell use a screwdriver to remove their lids and check if the Central Core D in figure 6 and the metallic shield B in figure 6 of the coaxial cable are connected to the first and fourth pin inside the
13. RRRMT EXAMPLE Easy SWEEP SOFTWARE INSTALLATION HARDWARE CONFIGURATION Bem M 22 OPERATION amp ACQUISITION MODE wissessssiscescsscsssccssccssscssccssecsscsssscsscssesessccsnscssccanscssccssscssccsoscssccsnscssccsseececcents 24 QUICK STUART mm n 25 DATA LOGGING TREE FINITE MEASUREMENT MODE csssccceessscecsssseceeseseceeseeeecsssseceesseeeeeesaececessececsaseeceesaeesenseaeees 28 FIGURES OF MERIT svccceasticcsencscccssnencesesssucesnsacseeescassseescsexsvenasessestencssesecdcucebececvenstes cvancasastavesessncestesctes 30 MAIN SEeenjpiece 32 APPLICATION AND GLOBAL SETTINGS SYSTEM SETTINGS OS CONTROL cates Eve Ee Peu cr PE SYSTEM SETTINGS APPLICATION CONTROL SYSTEM SETTINGS E MAIL SETTINGS nisi oan CUR EAR ACQUISITION SETTINGS EE RR NR FER ee ERU ra ee ENERO RC REN RENE ERROR cra Ossila Ltd User manual Version 2 Copyright 2009 2015 2 enabling innovative electronics ACQUISITION SETTINGS SMU SETTINGS sisi _____________ ____ 34 SENSOR SETTINGS SMIUSETTINGS esc teer der rera ev
14. it ideal for a wide variety of experiments including current voltage JV and current voltagelight JVL sweeps external quantum efficiency measurements and lifetime testing Features e Can be used with interchangeable boads to allow use with a variety of substrate geometries e Extremely low pixel path resistance and noise leakage current e Additional heatsink intergrated with the substrate holding bracket optional e USB interface with easy integration to LabVIEW MATLAB and others e Compatible with Linux OS Pocket PC and Windows e Onboard temperature sensor e On board reference photo diode optimised for visible response e Shutter control for external instruments e On board cooling fan to keep substrate temperatures constant e Optical window for experiments where optical access is required from both sides e M4 M6 and 1 4 mounting holes to make mounting on a variety of optical benches and other equipment quick and simple Please note that LabVIEW is a trademark of National Instruments and MATLAB is a trademark of The Mathworks inc Ossila Ltd User manual Version 2 Copyright 2009 2015 4 enabling innovative electronics Safety The Ossila USB test board is designed for low voltage low current applications and should not be used with high voltage or high current sources It is also designed for use only with equipment featuring current and voltage compliance limiting to avoid either damaging the devic
15. no measurement can be carried out Easy JV Sweep supports two main acquisition modes Finite Measurement and Continuous Measurement Finite Measurement one single measurement is carried out per substrate device Standard JV JVL characterisation The JV or JV JL curves and the figures of merit of the DUTs are then saved in a set of CSV files one per each acquisition session and data type For example the JV curves will be all saved on a single file so as to facilitate data handling and statistical analysis Continuous Measurement multiple measurement cycles of the selected devices executed consecutively or intermittently for a protracted period of time Continuous measurement is designed for gathering lifetime data on the device performance over a user defined period of time whose duration can be at the most infinite The diode figures of merit are stored as time series on a single file per device The same for the JV JVL curves Ossila Ltd User manual Version 2 Copyright 2009 2015 24 enabling innovative electronics Quick Start 1 On the main front panel click Add Settings to open the Application and Global Settings UI In the top right corner of this UI locate LT Data Storage and select which disk volume disk partition to use as data storage repository for Continuous Lifetime experiments Click on the ring control to see the available disk partitions and select one of them D for example as lifetime re
16. required to download NI applications and drivers Ossila Ltd User manual Version 2 Copyright 2009 2015 22 enabling innovative electronics For NI PXI On the left side panel click on the arrow next to NI PXle 1071 Chassis 1 to expand the associated tree menu e Right click on NI PXle 83060 and change the default alias name to Remote Control e Navigate to the two SMU units NI PXI 4132 and rename them as SMUA unit in slot 2 and SMUP unit in slot 3 These alias names are case sensitive e Save the new settings Note MAX allows the user to reset self test and self calibrate if applicable any NI hardware For VISA instruments such as Keithley MAX is shipped with an equivalent VISA Test Panels In addition it gives direct access to these instruments via text based command strings These functionalities usually require that the corresponding full hardware drivers are installed on the host computer see Easy JV Sweep Software Installation Model 26128 KeithleyO Measurement amp Automation Explorer 0 File Edit View Tools Help a moon H Refresh 4 Open VISA Test Panel m Communicate with Instrument e Interactive Control Hide Help Neighborhood Wl Devices and Interfaces B ASRLI0 INSTR LPT1 Settings 4 gt GPIB USB HS GPIBO Model 26128 KeithleyO Name KeithleyO What do you want to do NI USB 6501 SwitchControl20 6 NI USB 6501 USB1
17. section is exclusively intended for Ossila OPV system users and any other use is explicitly forbidden Please refer to National Instruments Measurement and Automation Explorer Help comprehensive documentation and User s guide MAX is an NI product covered by one or more of the following Patents U S Patent No s 6 690 390 7 130 760 7 134 109 7 152 116 Introduction MAX Measurement and Automation Explorer is the National Instruments application that provides direct access to NI hardware According to NI specifications MAX can be used to 5 MAX Measurement and Automation Explorer 1999 20013 National Instruments All right reserved Ossila Ltd User manual Version 2 Copyright 2009 2015 17 enabling innovative electronics e Configure your National Instruments hardware and software e Back up or replicate configuration data e Create and edit channels tasks interfaces scales and virtual instruments e Execute system diagnostics e View devices and instruments connected to your system e Update your National Instruments software Configure and Test National Instrument NI 6501B OEM Board Make sure that all the connections between the Ossila OPV System are well connected all the power cords are plugged in Open NI MAX 1 On the left side MAX subpanel click on My System NI USB 6501 Settings 2 Click on Device and Interface a list of devices installed or simulated on the computer will appear If the USB cable is pro
18. with the PXI hardware To configure multiplexor and SMU take the following actions see figure 12 e With the system fully set up i e with every hardware units properly connected see Hardware Setup open NI MAX and click on My System and the on Devices and Interfaces Multiplexor through NI USB Card e Search for Dev1 the identification number may be different see explanation above and right click on this entry to show the drop down menu options e Select Rename and rename Dev1 as USB1 this name is case sensitive For Keithley SMU e n Devices and Interfaces search for the GBIP device and with the mouse left click to expand the list of devices connected to the target PC through the GBIP interface e Ifthe list is empty on the control bar located on the top side of MAX right panel click on Scan for instrument e Providing Keithley 26XX SMU is properly connected and switched on MAX will identify this SMU with its VISA resource GPIBO NUMBER INSTR e Under Devices and Interfaces click on the VISA NAME to show the Settings panel for this VISA instrument on the right side panel of MAX e On the Settings panel go to Name and replace the default alias name with KeithleyO case sensitive e Save the new settings using the Save button on the control bar of the Settings panel If MAX is not yet installed please download and install it MAX is freely available at www ni com registration to NI website may be
19. 9 2015 14 enabling innovative electronics The temperature can be calculated according to the following formula note the output current is in pA 10 x Output current uA Temperature in Kelvin 227 WV Therefore the temperature in degree Celcius is equal to Temperature in degree Celcius Temperature in Kelvin 273 15 Response of the temperature sensor T T T 85 T T Current pA 0 10 20 30 40 50 60 70 80 90 100 Temperature C Temperature sensor TEMP P0 7 Output Equivalent circuit Cooling fan specifications The cooling fan is provided to keep devices at a constant temperature when illuminated under solar simulators Rated voltage 12VDC Rated power 0 48W Air delivery 4 6 CFM Power current 40 mA Heatsink There is an optional heatink which can be attached beneath the bracket to further cool the substrate Material aluminium Ossila Ltd User manual Version 2 Copyright 2009 2015 15 enabling innovative electronics Physical Characteristics Dimensions 190 mm L x 138 mm W x 40 mm H connectors 1x USB series B receptacle cable included o 3xBNC receptacle 1 2 way header pins to allow attachement of external photodiode Weight 245 g Insulating M6 bolts amp washers M3 screws USB A B cable is included Cooling fan and 12 V adapter included Ossila Ltd User manual Version 2 Copyright 2009 2015 16 enabling innovative electronic
20. Backshell The pins are numbered from top to bottom with the WARNING label of the Backshell on the right side see SMU specification Make sure that the Central Core and the metallic shield are connected through the Backshell to the High and Low output for both SMU channel The output type of the SMU can be read directly on their front panels If the Backshell are opened for maintenance before use make sure they are roperly sealed with both the Central Core and metallic shield tightly wired and completely enclosed inside the Backshell Ask the assistance of qualified technical support if not familiar with the maintenance of high voltage electrical equipment Figure 4 Coaxial cable internal details Warning If Easy JV Sweep stops but the Output Enabled LED of one or both PXI is still ON you must programmatically shut down the SMU Run a dummy acquisition few point for a single device so that the SMUs s with Output Enabled active are gracefully and safely switched off When the Output Enabled led is ON Shock Hazard exists User manual Version 2 Copyright 2009 2015 44 enabling innovative electronics e The OPV OLED Test Board does not work Action Ensure the power adapter properly plugged in check if the red Power LED is flashing Ensure the USB cable is properly connected to the USB B socket on the NI 6501 OEM board and the computer check the green LED on NI 6501 board is flashing e
21. Short Yes Short To short selected Pixels to Ground P2 1 Shutt off No Shutter To open close shutter on solar simulator P2 2 Fan Yes Turn on fan Output 2 3 Yes Allows external connection to Ext header P2 6 Error Set LOW for operation P2 7 Error Set HIGH for operation Ossila Ltd User manual Version 2 Copyright 2009 2015 11 enabling innovative electronics Controlling the Multiplexer The multiplexer is controlled by the NI 6501 board At the NI 6501 board startup and reset the hardware sets all DIO digital I O lines to high impedance inputs As each line has a weak pull up resistor of 4 7 kOhm connected to it all pins are set to HIGH The default output configuration of the port pins is open drain This configuration allows the digital output signal to swing to 5V Each port pin can be programmed as a digital input or output To operate the system the DIO lines should be programmed as digital outputs NI 6501 Board Digital Logic Levels Level Min Max Units Input Input low voltage 0 3 0 8 V Input high voltage 2 0 5 8 V Input leakage current 50 0 uA Output Output low voltage Open collector open drain or active drive push pull lo 2 mA 0 4 V lo 8 5 mA 0 8 lt Output high voltage Active drive push pull lou 2 mA 2 8 3 6 V 8 5 mA 2 0 3 5 V Open collector open drain 0 4 mA nominal 2 0 5 0 V Open collector open drain 7
22. ame DataFiles you need to navigate to the directory FileName and select Current Folder in the bottom right corner of the navigation windows see below Organize v New folder y Ft Favorites Name Date modified Type Downloads ExpName_Pid_Data 22 03 2015 17 50 File E ExpName_Pixt_Header 22 03 2015 17 49 File Desktop _ ExpName_Pix2_Data 22 03 2015 17 50 File Fabrication Testing Clients ExpName_Pix2_Header 2 03 2015 17 49 File _ ExpName_Pix3_Data 03 2015 17 50 File 53 Libraries L Header 2 03 2015 17 49 File F5 Documents ExpName Data 22 03 2015 17 50 File Music ExpName Pid Header 2 015 17 49 File Pictures _ ExppName Pix5 Data 22 03 2015 17 50 File Bl Videos ExpName Pi Header 22 03 2015 17 49 File _ Pi Data 22 03 2015 17 50 File Computer 2 Recent Places File name All Files 77 Canoe 7 Lifetime measurement is usually carried out by continuously measuring the DUTs However limited resources constrains on the use of the measurement infrastructure minimisation of the cost finite lifespan of solar simulator lamp etc can make continuous lifetime acquisition unfeasible However for environmental degradation studies periodical daily measurement can suffice By exploiting the continuous measurement mode feature the acquisition data can be automatically saved as time series instead of bei
23. anual Version 2 Copyright 2009 2015 26 enabling innovative electronics 9 Enter Settling Time The JVL Settling Time starts on completion of JV Settling Time see above and is therefore used to add a delay between the output current and photocurrent acquisition Unless a delay between the two current measurement is required set JVL Settling Time 0 Set Auto Zero Once 10 On the Sweep Setting panel define the sweep parameters by imputing in Volts Voltage Start Voltage End and Delta V The data points V are given by Va nAV Eq 1 with V 65 GS Starts 4 AV Eq 2 In addition to the data points specified in Eq 1 Easy JV Sweeps always acquires a data point at V 20 and V Vena Important No matter what the DUT architecture is see below Voltage Start must be negative and Voltage End positive 11 Dev Area specifies the pixel area in cm or the area of the windows of a measurement aperture mask 12 Select the Device Type Direct or Inverted Device Type is the architecture of the Cells e Direct or standard The electrons are supplied by a low work function metal such as calcium while the anode is a high work function material such as ITO e Inverted High work function metal such as ITO in combination with electron transport layer such as PFN can be used as cathode while the anode is provided by a second high work function material Al Ag etc 13 Short is u
24. ation and Global Settings This UI controls the application and SMU settings Windows Reboot Time m System Settings OS Control Windows Reboot Time sets the PC reboot time available in Continuous Measurement mode only Reboot enables disables the reboot functionality System Settings Application Control Self Calibration AutoRun enables automatic acquisition functionality whereby a lifetime A experiment is initiated whenever the application is started Use this functionally together with reboot to automatically restart a lifetime acquisition to initiate at a set date Note Easy JV Sweep not currently shipped with auto start functionality use Windows Time Scheduler with AutoRun set to ON to automatically start the application and initiate a life time acquisition at a predetermined time Self Calibration enables disables SMU self calibration routine at lifetime acquisition start This feature is available for PXI SMU only AUTORESET forces the application to execute a hard reset at when the application is started Controls available with NI PXI only Outgoing Mail Server SMTP Sender s Email Address emo rid Rep System Settings E mail Settings E mail Account Password It enables automatic e mailing functionally whereby errors and Enable SSL failures messages are e mailed to the e mail address specified in Sender s Email Address Available in Lifetime mode only
25. by the system SMU DUT to settle When the driving voltage is increased from an initial value Vstrat to a final value Vena the SMU is said to sweep the DUT The board and software are designed to characterise diode devices such as Organic Inorganic Light Emitting Diode OLED LED and Inorganic Perovskite based or hybrid photovoltaic cells OPV PV The characterisation is carried out by sweeping the DUT and reading the output current For LED OLED both output current and photocurrent are measured Finally both this manual and the Easy Sweep numerical controls conform with the SI International System system of measurement including the adoption of the SI prefixes for multiples and submultiples of the original unit For Example 0 01V is written as 1 mV see table below SI prefix Factor Symbol pico 10 p nano 10 n micro 10 milli 10 m Ossila Ltd User manual Version 2 Copyright 2009 2015 46 enabling innovative electronics Warranty Information and Contact Details Ossila warrants that a Ossila has or will have at the relevant time the right to sell the Products b the Customer shall enjoy quiet possession of the Products c the Products correspond to any description of the Products supplied by Ossila to the Customer d the Products are of satisfactory quality e the Products are fit for any purpose expressly but not merely impliedly made known by the Customer to Os
26. cular requirements for automatic and semi automatic laboratory equipment for analysis and other purposes IEC 61010 2 081 2001 Declaration hereby declare that the equipment named above has been designed to comply with the relevant sections of the above referenced specifications The unit complies with all applicable Essential Requirements of the Directives Signed Name Dr James Kingsley Date Ossila Ltd User manual Version 2 Copyright 2009 2015 enabling innovative electronics Hardware Setup Board Layouts Short indicator 16 External Error indicator 9 Connector 6 Power Indicator 8 Shutter BNC receptacle 1 68 Output BNC receptacle 2 USB connector 4 External BNC 8 receptacle 3 Interchangeable board connectors 14 DC power jack Cooling fan 12VDC 13 NI65010EM 12 LED switch 15 board 5 Figure 1 Main board layout Temperature sensor 11 POGO connectors 10 9 e 7 Q Photodiode 7 Figure 2 Interchangeable board layout Ossila Ltd User manual Version 2 Copyright 2009 2015 8 enabling innovative electronics Reference number Type Description 1 Shutter BNC This connector can be used to control the shutter of a connector solar simulator It is intended to be used with the Newport Oriel class A solar simulator or similar Shutter is ON wh
27. d to connect to the incherchangeable boards Connectors 15 LED switch Used to turn all the LEDs OFF 16 Short LED Indicator Indicates the short is ON Can be used to short any of the pixels 17 M3 Screws To stabilize the interchageable board and ensure correct connection Ossila Ltd User manual Version 2 Copyright 2009 2015 9 enabling innovative electronics Interchangeable board connection Care must be taken when connecting the interchangeable board to the main board to ensure the headers from the detacheable board are inserted correctly into the main boad connectors or sockets 14 see figure 1 If the header pins are inserted into the wrong sockets the board will malfunction To secure the interchangeable board in place there are four M3 screws 17 see figure 2 and figure 3 which also ensure the header pins are correctly aligned with the sockets Also note the interchangeable board has a marking TOP to show orientation y em i Figure 1 Connecting the Interchangeable board to the main board Ossila Ltd User manual Version 2 Copyright 2009 2015 10 enabling innovative electronics Operating the System Plug in the 12V power supply into the DC power jack 13 and the USB cable to the USB B socket 4 on the NI 6501 OEM board see figure 2 At system startup if the 12 V power adapter is plugged in the red Power LED 8 will be flashing The green LED on the NI 65010EM should also be flashing The r
28. e hacen ____ _ ______ __ __ 34 CONTINUOUS MEASUREMENT LIFETIME EXPERIMENT ccsscccsscccscccsscccscccsscccscccnssccssccnscccssccescccesscosscees 35 LIFETIME LOGGING TREE STRUCTURE 36 M 37 CONVERT BINARY INTO SPREADSHEET DATA cccccsessssecececectensseececececeenenesceeeceaeesseececeseauenssceceeeeeaueneseeeeeeeeauaneseeeeeseeags 38 MEASUREMENT AND ACCURACY eoo ks ores acere aen es eve sete seonsuao kso see novae ua eee Sene oa e quU FO ON eae SRS Oe SORTE OUSETO 40 TEMPERATURE AND SELF CALIBRATION cesses nennen nnne nens nnne nne ness essa ee s essen nennen enn 40 CALCULATION OF THE MEASUREMENT ACCURACY eren sess snas aene sensn nan 40 TEMPERATURE EFFECTS SMU ACCURACY sisse sess nee sss e sss 42 TROU BLESHOOTIN cmee 43 GUIDE TO THE READER SYMBOLS ACRONYMS COMMON DEFINITIONS e eere eene nennen nnne 46 WARRANTY INFORMATION AND CONTACT DETAILG ccssccsssccessccsstccssccescccssccnssccesccessccssscusccceneceneceesseoens 47 APPENDIX gee
29. e new data folder with the exception of the file with extension ddl e Copy all the files in the old data folder to the new data folder again with the exception of the file with extension ddl Note Make sure to delete every single file in the new data folder and replace them with the entirety of the file in the data folder with the exception of the ddl file otherwise the application may stop working properly Alternatively before re installing the application delete the data folder to delete any previous reference to old experiment settings Ossila Ltd User manual Version 2 Copyright 2009 2015 21 enabling innovative electronics Hardware Configuration In order for the application to communicate and control the acquisition hardware SMU alias names must be assigned to the SMU and peripheral units through NI MAX Measurement amp Automation Explorer NI National Instruments hardware will appear on MAX with their factory alias name For example the multiplexer unit hosts a NI USB card interface and will appear MAX as Dev1 If more than one NI USB card has been connected to the target computer MAX will automatically assign a different sequential number to the multiplexor Important If the SMU of choice is the 4132 NI PXI the computer needs to be rebooted after the chassis is turned on in order to ink the PXI to the target PC If the reboot is not executed neither MAX nor SuperFACT will be able to communicate
30. e under test or board electronics Warning To avoid safety hazards obey the following Only connect to low voltage lt 20 V current lt 100 mA continuous power supplies Do not leave devices with applied bias or current unattended as a power failure may result in board damage or device damage and potentially hazardous situations Caution To avoid damaging devices or equipment obey the following Avoid electrostatic discharge ESD as this may damage the device The Ossila OPV System uses MOSFETs which are static sensitive To avoid damage use static discharge and prevention equipment where necessary Only use the System for the purposes intended described in this document Do not expose the Board to any cleaning fluids or solvents When a USB lead is first connected to the test board all pixels and outputs are switched to off except the shutter and error LEDs However when USB connector is removed devices may be left in either an on or off state As such do not apply voltages or currents to the board without the USB power being applied Ossila Ltd User manual Version 2 Copyright 2009 2015 5 enabling innovative electronics EC Declaration of Conformity In line with directive 2004 108 EC of the European Parliament and of the Council and directive 2006 95 EC of the European Parliament and of the Council Manufacturer Name Ossila Limited Manufacturer Address Kroto Innovation Centre North Campus Broad Lane Shef
31. ed Error LED 9 will be on security bits have not been set and the Shutter Off LED will be on Shutter is off when P2 1 is set HIGH All other LEDs should be off Security Bits The security bits P2 7 and P2 6 must be set to control any of the functions except the shutter To set P2 6 LOW P2 7 HIGH If the Red Error LED is on it indicates that the security bits have not been set LED Switch The LEDs can be switched off via the LED SW if the measurement needs to be carried out in the dark Shutter The shutter is controlled by P2 1 when set HIGH the shutter is closed LED is on When P2 1 is set LOW the shutter is opened The control can be applied to the solar simulator via the shutter BNC connector on the board The shutter is the only function not controlled by the security bits This fuction applies to solar simulators similar to the Newport Oriel Solar Simulators whose shutters open when the shutter control is pulled LOW Digital DIO lines Signal Direcuon LED Security oltre Indicator Bits Description selectable PO O Output PD Yes Photo diode on Interchangeable board PO 7 Temp Sens Yes Temperature sensor on interchangeable board P1 0 Px1 Yes To select Pixel 1 P1 1 Px2 Yes To select Pixel 2 P1 2 Px3 Yes To select Pixel 3 P1 3 Output Px4 Yes To select Pixel 4 P1 4 Px5 Yes To select Pixel 5 P1 5 Px6 Yes To select Pixel 6 P1 6 Px7 Yes To select Pixel 7 P1 7 Px8 Yes To select Pixel 8 P2 0
32. efore y x For an 8 NI DC power Supply SMU Help Ossila Ltd User manual Version 2 Copyright 2009 2015 40 enabling innovative electronics actual SMU however m 1 and b 0 For example for the NI PXI 4132 current measurement accuracy at 23 C 5 C is reported in the table below from NI PXI 4132 Specification Current Measurement Accuracy and Resolution Range Resolution Accuracy 96 of reading offset 10 pA 10 pA 0 028 1 0 nA 100 100 0 028 10 1 1 0 028 0 1 10 mA 10 nA 0 028 1 0 100 mA 100 nA 0 028 10 A Here resolution means the smallest difference in current that the SMU is capable of discriminate while accuracy is the measurement uncertainty From this table and Eq 5 the accuracy of a current 2mA measured in the 10 mA range is then given by m 0 028 x 2mA and b 1 0 Accuracy 2 x 0 028 100 mA 1 0 0 56 pA 1 0 pA 1 56 uA Therefore the current and its uncertainty 2mA 1 56 pA Easy JV Sweep automatically selects the appropriate measurement range depending on the PXI Current Limit chosen by the User For each current acquisition chose the appropriate Current Limit i e a value that is greater than the maximum expected current under measurement but not greater than the lowest SMU current range required for the measurement For example if Current Limit is set to 10 uA or less SMU carries
33. en P2 1 is pulled low The shutter LED indicates when the shutter is OFF 2 Output BNC connector Output or input connector for the DUT as well as the temperature sensor and photo diode with programmabable switching 3 External BNC Linked directly to the 2 way EXTERNAL header connector connector 6 It can be used for further expansion of the test board 4 USB connector Type B USB connector that allows for connecting a type A B USB cable between a PC and the NI 6501 OEM board to control the multiplexer 5 NI 6501 National Instuments NI 6501 OEM Board 6 External Connector Can be used to attach an external photodiode The Ext LED indicates when this connector active ON 7 Photo diode Photo diode with a peak sensitivity at 550nm Note The photodiode is foward biased The PD LED indicates it is ON 8 Power LED Flashing LED to indicate 12 V power is connected 9 Error Indicator Switches on when the security bits have not been set To set the security bit set P2 6 Low and P2 7 High 10 POGO connectors POGO connectors to make contact with the substrate 11 Tmperature Sensor A temperature sensor that outputs a current directly proportional to the temperature in Kelvin allowing easy measurement and calibration The Temp Sens LED indicates it is ON 12 Cooling fan Cooling fan to ensure a stable substrate temperature The Fan LED indicates it is ON 13 DC power jack Used to power the cooling fan and the main board 14 Interchangeable Use
34. er the measurement Temperature and Self Calibration As specified by the Keithley 2612B Specifications the SMU should be operated at a temperature of 23 C 5 C lt amp 0 96 of humidity Outside this temperature range the nominal resolution of both output and measurement cannot be guaranteed Operating under high humidity 29096 or dusty conditions may cause increased leakage between circuit components and can result in additional sourcing and measurement errors To limit the detrimental effect of temperature humidity and ageing is advisable to execute a Self Calibration regularly through Measurement and Automation MAX Self Calibration through MAX is available for supported hardware only Note Execute the self calibration after 10 15 minutes the SMU are switched on so to allow enough time for both SMUs to reach a stable internal temperature Set the chassis fan toggle on the back panel of the chassis on the high position to allow better control of the internal temperature and reduce output input noise Calculation of the Measurement Accuracy Note The example below apply to any SMU For information about range accuracy temperature correction factors refer to the SMU manuals For a SMU the transfer function is given by y gx b 5 where is the gain b the offset x the input and the output The transfer equation describes how nominal output x is sourced by the SMU For an ideal SMU b 0 and m 1 and ther
35. eriment substrate is saved with a different data logging tree structure In fact if the new experiment shares Volume SweepType ExpName and FileName with the old one the new data will be appended to the old substrates data files s Here a represents a specific DUT lifetime acquisition cycle So a 1 for the first acquisition a 2 for the second acquisition cycle and so on so forth The DUT figures of merit PCE for example are then saved as to PCE 2 to etc For example plotted as function of At PCE At represents the time series lifetime curves of the solar cell efficiency Ossila Ltd User manual Version 2 Copyright O 2009 2015 37 enabling innovative electronics If multiple substrates are employed for a lifetime experiment to avoid mixing the data from different substrates the user must define a unique Experiment Name for each substrate Convert Binary Into Spreadsheet Data To convert the lifetime data from binary to comma separated value files readable by any spreadsheet application such as MS Excel follows the step detailed below 1 Open Easy JV Sweep data conversion Ossila Data Converter Experiment 4 D LifeTime_Ossila_MB Target Path 8 C Users User Desktop 2 Use the Brower button of the Experiment path input to navigate to the folder containing the binary data file For example if the DataFiles are stored in Volume LifeTime_Ossila_MB SweepType ExpName FileN
36. err enabling innovative electronics Ossila Multifunctional PV OLED Measurement System User Manual 1 t USB 6501 OEM enabling innovative electronics CONTENTS BOARD LAYOUTS INTERCHANGEABLE BOARD CONNECTION is Er exu eroe d ek er rece e e d x e E c E d 10 OPERATING THE SYSTEM 55 5 11 REOR EEUU TET T 11 LED SWITCH SAUTER ETE DIGITAL DIO HEUTE CONTROLLING THE MULTIPLEXER SYSTEM SPECIFICATIONS ccccsssssessssteeesssseeessssceeeesseeesssnseesessneeesessneeessssceeeessaceeeessneeesesceesessaeeesessseeesesaseeees 13 ABSOLUTE MAXIMUM RATINGS ELECTRONIC SWITCH SPECIFICATIONS vcie YR 14 PHOTO DIODE SPECIFICATIONS cemi Rive vo ER Edd 14 TEMPERATURE SENSOR SPECIFICATIONS sssessececececeessscececeseauensseecececeauenssceceeeeeeusneseeceseceanenesceceseauensneeeeeestanegseeeeees 14 COOLING FAN SPECIFICATIONS 2 eod Ua E E EAE EN 15 Tec 15 PHYSICAL GHARACTER STICS 2 5 ocio n oec e ________ _____ _ ______ _____ pane RE 16 SOFTWARE DRIVER E 17 MAX MEASUREMENT AND AUTOMATION EXPLORER ssccssssssecessseceessseeceesaececssseceesseseceesaeesceussececsaeseceesaececsesseceees 17 650120
37. field 53 7HQ Item OFET testing rig for use with PXI system Model number Software release Easy JV Sweep Specifications of product under harmonised standards 2004 108 EC EN 61326 1 2006 Electrical equipment for measurement control and laboratory use requirements Part 1 General requirements IEC 61326 1 2005 EN 61326 2 1 2006 Electrical equipment for measurement control and laboratory use requirements Part 2 1 Particular requirements Test configurations operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications IEC 61326 2 1 2005 2006 95 EC EN 61010 1 2010 Safety requirements for electrical equipment for measurement control and laboratory use Part 1 General requirements IEC 61010 1 2010 EN 61010 2 030 2010 Safety requirements for electrical equipment for measurement control and laboratory use Part 2 030 Particular requirements for testing and measuring circuits IEC 61010 2 030 2010 Ossila Ltd User manual Version 2 Copyright 2009 2015 6 enabling innovative electronics EN 61140 2002 Protection against electric shock Common aspects for installation and equipment IEC 61140 2001 EN 61187 1994 Electrical and electronic measuring equipment Documentation IEC 61187 1993 Modified EN 61010 2 081 2002 Safety requirements for electrical equipment for measurement control and laboratory use Part 2 081 Parti
38. hley will return a timeout error Ossila Ltd User manual Version 2 Copyright 2009 2015 25 enabling innovative electronics Enter Current Limit Current Limit in Ampere specifies the maximum current that the SMU is expecting to measure during the current session Therefore the SMU determines the measurement current range from this value For more information on Current Limit measurement range and the implication of the latter on resolution and accuracy refer to Calculation of the Measurement Accuracy and to the SMU Data Sheet Bp Ossila Input Experiment Settings Test_NO_DUT Keithieyo 1m 5 _ KeithleyO 0 0 5 smub Once smua Once e 1 1 50m Ossila Perovskite 10 002 00 00 io DD MM YYYY 4 LETS 00 00 00 SHUTTER OFF 4 Commit Exp Direct Open Sub1 4 C Users Pier ccmEG 6 For OLED LED only On the SMU Setting JL Photocurrent panel press JVL to enabled photocurrent acquisition Enter the SMU Name and Channel SMU Name is the SMU alias name specified in MAX KeithleyO or SMUA while channel is smua for Keithley SMU 0 for PXI Enter Current Limit in Ampere to specify the maximum current that the SMU is expected to measure during the acquisition session Ossila Ltd User m
39. ing a sensor reading Ossila Ltd User manual Version 2 Copyright 2009 2015 34 enabling innovative electronics Continuous Measurement Lifetime Experiment Continuous mode acquisition is used to carry out lifetime characterisation of the DUTs The JV JVL and the relevant figures of merit are saved as time series i e as function of the elapse time At t to with t time at which the measurement is taken and experiment starting time To set up a lifetime experiment follow the instruction below 1 On the main UI press Add Settings to open the Application and Global Settings UI In the top right corner of this UI locate LT Data Storage and select the disk volume disk partition to allocate for data storage Upon pressing Go To Exp the current UI is closed and replaced by Experiment Settings UI On Experiment Settings fill the controls panels SMU Setting JV SMU Setting JL for OLED Sweep Setting and Experiment as detailed in the Quick Start section of this User s Manual points 3 to 17 Measurement Cycle Timelimit Life Time End 00 00 DD MM YYYY Meas Interval 5 00 00 00 On the Life Time panel enable continuous measurement mode by selecting Ad Infinitum or Time Limit option from the drop down menu of Measurement Cycle ring control Measurement Cycle options Select Continuous mode disabled only one acquisition per DUT is executed duri
40. ions Each indvidual pixel as well as the photodiode and temperature sensor can be turned on off electronically through a network of high performance relays Each pixel device is connected to the output BNC Relay specifications Max switching voltage 220 V DC Rated current 2A Capacitance between open contacts 1pF Minimum Relay switching voltage 100uV Relay initial contact resistance 50 at 10 mA 20 mV Relay operate time typ 3 ms max 5 ms The multiplexer comprises eleven single channels It is capable of switching one or multiple inputs to the common BNC output A switch is turned ON by setting the corresponding control bit into the HIGH state Similarly the switch is turned OFF by setting the control bit into the LOW state Photo Diode Specifications The on board GaP photo diode has been chosen to give a response in the visible spectrum with a peak sensitivity at 550 nm the photodide is foward biased Parameter Type Unit Active area 9 8 mm Peak sensitivity typ 550 nm Sensitivity spectral range 400 700 nm Acceptance angle half angle 60 deg Reverse dark current 100 nm Photo diode PD 0 Output mn gt AA Equivalent circuit Temperature Sensor Specifications The temperature sensor acts as a current source with an absolute accuracy of 3 C with an output current directly proportional to temperature in Kelvin Ossila Ltd User manual Version 2 Copyright 200
41. ment and file name as specified on the Experiment Settings Ul with the ExpName and FileName controls DataFiles are the files containing the raw measurement and the DUTs figures of merit Important The data are saved in binary format and therefore are not directly human readable Use Ossila Data Converter to convert the binary file into comma separated values csv files CSV files can be opened by any spreadsheet application including MS Excel See section Convert Binary Into Spreadsheet Data below for detailed instructions on how to quickly and easily convert binary into CSV files Lifetime Start Time Lifetime data is saved as functions of the time elapsed from the beginning of the acquisition It is therefore paramount that the user makes sure that Easy JV Sweep records the correct start time Easy JV Sweep takes the time tg at which the lifetime experiment was saved as starting time of the experiment The elapse time At at t is then calculated as At ta to with t time at which the measurement a is taken It follows that the User must save the lifetime experiment settings just before starting new experiment settings Important If the same experiment setting is later on used for different substrates the User must resave this experiment or overwrite it to make sure that the new starting time is correctly recorded The User should also make sure that either the older data is removed from the data storage directory or the new exp
42. n LabVIEW and MATLAB can be found on the product webpage at www Ossila com e MATLAB code example LabVIEW code example Ossila Ltd User manual Version 2 Copyright 2009 2015 19 enabling innovative electronics Easy JV Sweep Software Installation To install the application Insert the installation CD in the target computer Copy the rar folder containing the application to the target computer Uncompress the folder and browse to the executable file called setup contained in the Volume folder Note Do not move modify or delete any file or folder contained in the Volume folder prior completion of the installation Run the executable and follow the instructions to install the application in C Programme Files 86X Easy JV Sweep The drivers shipped with the application will be automatically installed in the folder C Programme Files 86X National Reboot the target computer to complete the installation You can now remove the both rar and Volume folders Important Do not install this application on a target computer running Labview If the target PC is already running Labview you should run the executable instead Contact Ossila at info ossila om for further information on installing and using the executable on a target computer already running Labview Required drivers 1 2 3 4 5 6 7 8 LabVIEW Run Time Engine 2014 or later version NI 488 2 Application Development Support 14 0 or later versi
43. ng recorded as separate files as it is the case for finite measurement Ossila Ltd User manual Version 2 Copyright 2009 2015 38 enabling innovative electronics 3 Using the browse button of the Target Path control select the target directory i e the directory where the CSV files are to be saved 4 Press Save As Excel to convert and save the binary file in CSV files 5 Hit Exit to exit the Data Converter Important Target Path cannot be a sub path of the Experiment path i e you cannot save the CSV file in the directory containing the binary file otherwise Data Converter will return an error Ossila Ltd User manual Version 2 Copyright 2009 2015 39 enabling innovative electronics Measurement and Accuracy The two PXI Source Measurement Units SMUs are capable of very accurate voltage and current measurements see SMU Specifications section in the NI PXI 4132 Specifications documents The sensitivity and accuracy of the SMU is strongly affected by electromagnetic noise such as the one generated by mobile phones computers too close to the SMU etc temperature and most importantly the PXI measurement settings In particular when low currents of the order of magnitude of few tens of nano Ampere or less are measured external interferences and inappropriate setting may sensibly reduce the accuracy or if the order of magnitude of the noise is comparable or larger than the current being measured even hamp
44. ng the measurement session Time Limit Continuous mode is enabled and the DUTs are swept up to the time specified in Life Time End Ad Infinitum Continuous mode is enabled The experiment will continue to run unless the User terminates it by pressing the STOP button on the main User Interface Specify the interval idle time between two consecutive acquisition cycles through the Meas Interval controls The time interval is imputed as Hours H Minute M and Second 5 Ossila Ltd User manual Version 2 Copyright 2009 2015 35 enabling innovative electronics Fan During Sweep LT Fan Idle Time LT Shutter Idle Time 7 turn ON OFF the fan during JV sweep set the Fan During Sweep control on the Application Control panel to ON OFF LT Fan Idle Time turns ON OFF the fan during the idle time between acquisition cycles Note If Fan During Sweep OFF and LT Fan Idle Time ON and Meas Interval is different from zero the fan will be operating during the idle time only 8 The shutter can be set to remain open during the idle time through the LT Shutter Idle Time button Note For JVL acquisition setting LT Shutter Idle Time has no effect on the shutter TTL output but it will force the external channel see Board Layout to remain open during idle time 9 Hitthe Save button to save the experiment settings 10 To run the experiment press Load Settings button on the main UI and surf through the
45. on NI DCPower Development Support only for NI PXI 4132 SMU NI DAQmx Runtime with configuration support NI System Configuration Runtime NI Measurement amp Automation Explorer 14 NI VISA Runtime Engine 14 0 or later version NI VISA Configuration Support 14 0 or later version The drivers are shipped with the application and are automatically installed by the NI Installer on the target PC Post installation After installation a shortcut should appear on the User Desktop If the shortcut fails to show Navigate to the application executable in C Programme Files 86X Easy JV Sweep For this drivers install the full development support to allow full configuration control through MAX For this drivers install the full development support to allow full configuration control through MAX and the soft panel NI native User Interface functionalities Ossila Ltd User manual Version 2 Copyright 2009 2015 20 enabling innovative electronics e Place the cursor on the application s icon right click the mouse button and select Create Shortcut e When prompted with the query Windows cannot create a shortcut here Do you want to place the shortcut on the desktop instead select Yes Windows will automatically place the shortcut on the User s desktop Important The icon itself i e the executable must not be moved to any other location on disk otherwise the application will stop working properly Enabling data se
46. one Load Settings loads into memory and commits an existing experiment setting To commit an experiment s settings 1 Click the Load Exp button on the main UI the List of Saved Experiment UI will open 2 OnList of Saved Experiment UI select the experiment that you want to commit and press the blue Commit button The Application and Global Settings UI will open Press the Go To Exp button to confirm the advanced setting On the Experiment Settings Ul press Commit to commit the current experiment This experiment is executed by pressing Start on the main UI FAN switches the board fan ON and OFF Control not available while an experiment is running SHUTTER opens closes the shutter This control is not available while an experiment is sumero running or for JVL OLED LED acquisition Note Shutter send a TTL signal to the shutter The ouput signal however is inverted i e the ouput is LOW lt 2 V when the SHUTTER is ON and HIGH 2 6 V lt Shutter lt 5V when the SHUTTER is OFF HW RESET is used to reset the hardware SMU and USB Card and to refresh the HW RESET display STOP interrupts the running experimnet If Easy JV Sweep is operating in Continuous Measurement Mode lifetime the experiment is stopped after the current substrtate cycle is completed i e after all the DUTs are swept Ossila Ltd User manual Version 2 Copyright 2009 2015 32 enabling innovative electronics Applic
47. out the measurement in the 10 range On the other hand if the maximum current is expected to be 50 60 uA choose as Current Limit any value greater than 60 and not larger than 100 uA 100 uA is acceptable For the sake of easy reference the PXI voltage output and voltage measurement accuracy and resolution are also reported in the two tables below Voltage Output Accuracy and Resolution Range Resolution Accuracy of reading offset 10 V 50 uV 0 025 3 0 mV 100 V 500 uV 0 025 10 mV Voltage Measurement Accuracy and Resolution Range Resolution Accuracy of reading offset 10 V 10 uV 0 02 3 0 mV 100 V 100 uV 0 02 5 0 mV Refer to NI PXI 4132 Specification for more detailed information on output and measurement accuracy and resolution Ossila Ltd User manual Version 2 Copyright 2009 2015 41 enabling innovative electronics Temperature Effects on SMU Accuracy Devices operating outside the five degree range of the last calibration temperature with the calibration carried out no later than one year from the time the acquisition is carried out have an accuracy that is given by the sum of the factory standard accuracy see above with an extra term depending on the Tempco temperature coefficient where Tempco is express as of the factory accuracy specification per degree C For both NI PXI 4132 and Keithley 26128 Tempco is 0 15 As an example let us suppo
48. perly connected to both PC and the OPV System the NI USB 6501 icon 15 green The icon of a device installed but not currently present or properly connected is grey with a superimposed red cross When first installed MAX assigns a standard alias name to MAX compatible hardware For NI USB 6501 this is Devn where n is a integer indicating the number of device currently installed on the computer If required o change the alias right click on the alias name select Rename on the drop down menu and input the new alias 3 Familiarise with the tool bar commands on the central subpanel of MAX see Fig 6 Use Reset to reset the hardware and Self Test to test the hardware NI 6501 OEM Outputs The USB 6501 controller has 24 DIO channels arranged in three groups of eight Signal Port 0 Signal Port 1 Signal Port 2 0 Photodiode P1 0 Pixel 1 2 0 Short Unused 1 1 Pixel 2 P2 1 Shutter PO 2 Unused P1 2 Pixel 3 P2 2 Fan P0 3 Unused P1 3 Pixel 4 P2 3 External P0 4 Unused P1 4 Pixel 5 P2 4 Unused PO 5 Unused P1 5 Pixel 6 P2 5 Unused 0 6 Unused P1 6 Pixel 7 P2 6 Safety bit Low 7 Temperature P1 Pixel 8 P2 7 Safety bit High sensor Measurement and Automation Explorer Help Version 370694R 01 June 2013 Ossila Ltd User manual Version 2 Copyright 2009 2015 18 enabling innovative electronics Code example Code examples written i
49. pository Note If you are using NI PXI 4132 you must also select the appropriate PLC Power Line Cycle located on the SMU Settings setting control cluster of this UI Test NO DUT System Setting Acquisition Settings OS Control ing LT Data Storage Windows Reboot Time i Disk Volume SM Last Reboot Time i i Free Space GB Hard Reset at Start 59 E mail Settings Outgoing Mail Server SMTP Sender s Email Address smtp gmail com E mail Account User ID Recipient s Email Address ing Meas Setting Sender s Name Recipient s Name Upon pressing Go To Exp the current UI is closed and replaced by Experiment Settings UI On Experiment Settings locate the SMU Setting JV control panel located on the top left side of the screen and enter the SMU Name and Channel name SMU Name is the SMU alias name specified in MAX KeithleyO or SMUB while channel is smub for Keithley SMU or 0 for Set Auto Zero Once Enter the Settling Time the settling time For Organic OPV OLED settling time can varies from few milliseconds or lower to tens of milliseconds See Sensor Settings SMU Settings for further information on the choice of the settling time Note The unit of measure of Settling Time is seconds Enter 0 1 or 100 m to set a 100 milliseconds gate source settling time Do not enter very large delay time such as 10 secs otherwise Keit
50. r of sample to average supported by the SMU Aperture Time sets the duration of a single current or voltage reading Aperture Time is expressed in unit of PLC The actual value of Aperture Time therefore depends on the PLC frequency as detailed in the following table where Aperture Time is expressed in term of PLC units and seconds s s ____ 133ms_ 160 ms 4 4 80 0 ms As for sample to average longer aperture time increases accuracy by slowing down the acquisition rate Ear Acquisition Settings SMU Settings 59 Storage Volume specifies the disk volume partition used as repository for the life data acquisition To be used as repository volume a disk partition must have at least 1 GB of free space Important You can use external disk partition as well such as USB memory card server s volumes etc If you use an external memory storage facility make sure that the connection with the host computer is stable and reliable so as to avoid data acquisition failure due to the peripheral becoming disconnected and or irresponsive Sensor Settings SMU Settings The panels in this section control the sensor on the board photodiode and temperature session The same as SMU Settings it controls the SMU setting for sensor acquisition Current Limit specifies the maxium current in ampere that the sensor is expected to ouput Settling Time is the time that the SMU is forced to wait before tak
51. s Software Driver The Ossila OPV System is controlled by a National Instruments USB 6501 OEM system to allow easy interface with a range of languages and is compatible with Linux Mac OS Pocket PC and Windows Languages that can be used include LabVIEW e MATLAB Data Acquisition toolbox required e ANSIC e LabWindows CVI e Measurement Studio e Visual Basic e Visual Studio e Visual Studio NET In order for the Ossila OPV System to be recognised by your computer please ensure that the National Instruments DAQmx driver version 14 1 or above is installed on your system Many computers running LabVIEW with other national instruments hardware will already have DAQmx drivers installed and should recognise the board instantly To check if DAQmx is installed on a PC navigate to Start Menu gt All Programs National Instruments and look for NI DAQ If DAQmx is not installed on your system please download and install it from the National Instruments Website www ni com where it is available free of charge registration required MAX Measurement and Automation Explorer Legal Notice This section is neither a comprehensive nor a partial User s guide to Measurement and Automation Explorer or any other National Instruments hereafter NI products The scope of this section is to provide the Users with the information necessary to install test and maintain the accuracy level of the Ossila measurement system Accordingly this
52. se that a PXI calibrated at T 25 C is operated at 35 C The PXI is used as SMU with output voltage 20 V From the Voltage Output accuracy table and Eq 5 the uncertainty on the output is given by Accuracy 20 x 0 025 100 10 mV 15 mV The correction factor due to the temperature is Temp Accuracy Accuracy x Tempo 100 Calibration_temp Meas_Temperature 15x0 15 10 22 5 mV The PXI output is then given by Vout 20 V 37 5 mV Ossila Ltd User manual Version 2 Copyright 2009 2015 42 enabling innovative electronics Troubleshooting Easy JV Sweep does not start Check if the programme is installed Action Required Go to Start gt gt Control Panel gt gt Programs gt gt Programs and Features Easy JV Sweep does not appear in the list of installed programs reinstall Easy JV Sweep Easy JV Sweep opens but it returns message 5018 or 5019 or 5020 or 5021 or 5022 These errors codes are associated with an issue with the current Measurement and Application Setting files Action Required None These two files are rewritten every time that an error or a new setting is applied and measurement is started If the error persists contact the technical support at Ossila Easy JV Sweep opens but it returns the error message 5040 Action Check the USB connection PC Multiplexer You can use MAX Measurement amp Automation explorer to check whether the multiplexer is correctly connected to the PC by
53. sed to set the pixel status between two consecutive measurements in continuous acquisition mode If Short is set to Short the cathode and anode of each pixel on the substrates are shorted together i e the measurement circuit is closed Conversely If Short is set to Open the cathode and the anode are floating i e they are not connected together Ossila Ltd User manual Version 2 Copyright 2009 2015 27 enabling innovative electronics 14 On Experiment Settings fill in the entries User Name Exp Name and File Name These inputs are used by JV Easy Sweep to create a User s data logging directory tree refer to the section Data Logging for more information 15 Use the browse button of Data Folder Path to enter the path to the directory to be used as repository folder i e the folder containing the data logging directory tree see above 16 Select the pixels to measure by pressing the corresponding button 1 for Pixel 1 2 for pixel 2 and so forth 17 Optional Use Notes input field to save any relevant annotations 18 Press the Commit button to save the experiment settings 19 To start the experiment press Start on the main UI enter the file name and press OK The acquisition will start Note A committed experiment is loaded into memory but not permanently saved and therefore it will be overwritten every time a new experiment is loaded into memory or the application is closed Save Experiment Settings If
54. sila before the relevant Contract is made f the Products correspond to any sample of the Products supplied by Ossila to the Customer and will be free from any defect making their quality unsatisfactory which would not be apparent on reasonable examination of the sample g the Products will comply with all laws rules regulations applicable to the marketing and sale of the Products in United Kingdom h if within one year of purchase the customer experiences system failure or damage within reasonable constraints the system may be returned to Ossila for maintenance Please note that if any system compartment is opened within this period warranty will be voided To the best of our knowledge the technical information provided here is accurate However Ossila assume no liability for the accuracy of this information The values provided here are typical at the time of manufacture and may vary over time and from batch to batch Ossila Contact Details Kroto Innovation Centre Technical Contact North Campus Dr James Kingsley Broad Lane j kingsley ossila com Sheffield 53 7HQ UK Customer Services Contact Lucy Pickford Phone no 44 0 114 213 2770 pickford ossila com Fax no 44 0 800 098 8142 Ossila Ltd User manual Version 2 Copyright 2009 2015 47 enabling innovative electronics Appendix Note on transient time If the capacitance and resistivity component of the measurement apparatus and of the DUM
55. the experiment settings are intended to be used for successive acquisitions these settings can be permanently saved by making use of the Save button on the Experiment Settings UI Important If you save an experiment you still need d to commit it in order to execute the experiment refer to the section Main UI Controls below detailed instruction on how to commit an experiment Important Upon pressing Start on the main UI Easy JV will execute the experiment settings of the last committed experiment If you choose to save an experiment by pressing Save Easy JV will not update the settings loaded into memory Consequently to use a newly saved experiment you always need to commit it first Refer to the Main UI Control below for details instruction on how to commit a saved experiment Data logging Tree Finite Measurement Mode JV acquisition For each acquisition session the data and OPV PV figures of merit are saved in a set of three files namely 1 Y M D hh mm ss FileName Header Ossila Ltd User manual Version 2 Copyright 2009 2015 28 enabling innovative electronics 2 Y M D hh mm ss FileName JV Sweep 3 Y M D hh mm ss FileName Data The first part of the name is a time stamp recording the date of the acquisition with Year Y Month M and Day D The acquisition time is specified as hours hh minutes mm and seconds ss The first file Header is a plain text file txt containing the acquisition parameters Vstart
56. ttings storage folder The application allows the user to save the Experiment Acquisition settings in an appositely created data folder contained in C Programme Files 86X Easy JV Sweep V If you are using Windows 7 8 8 1 or later distributions you must enable the application to write the data folder supportfiles Properties To change the data folder access permission General Sharing Securty Previous Versions Customize Obj o CAUsers Pier Desktop builds Ossila IV Probe Ti e Navigate to C Programme Files 86X Easy em E mnes JV Sweep and right click the data folder nie kalenda SYSTEM e On the drop down menu click on Pier SHEFFIELDUK Pier 82 Administrators SHEFFIELD UK Administrators Properties and tab menu of select Security e Under Group or user names select the To changa pees relevant PC user Permissions for Pier Allow Deny e Click on edit and make sure that Full Full control Modify Ww control is ticked Had 2678 e Press apply and then OK List folder contents Read RT Writ Reinstalling the application Lt For special permissions or advanced settings To avoid losing experiment acquisition settings the click Advanced User is strongly advised to Leam about access control and permissions e Make a copy of the data folder e After the re installation is completed delete the content of th
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