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1. 5G INSIGHTS Keysight engineers are active in the leading 5G forums and consortia Keysight engineers are keynote speakers at 5G conferences and key contributors in top technical journals Applications engineers are in more than 100 countries around the world ration Download our white paper mplementing A ON a Flexible Testbed for 5G Waveform l Generation and Analysis at www keysight com find 5G Insight ima i Snare ast Doone rrsan AA KEYSIGHT USA 800 829 4444 CAN 877 894 4414 Keysight Technologies Inc 2015 HARDWARE SOFTWARE Designed for testing 5G simulation to verification Software platforms and applications that work seamlessly across our 5G instruments Incorporate iterative design and rapidly move Keysight 5G Baseband Exploration between stages of your 5G development flow Library for SystemVue Industry s first and largest 5G library Industry s first 5G Exploration i Library for researchers Keysight N7608B Signal Studio for custom modulation Keysight N9040B UXA signal analyzer with 89600 VSA software and M1971E smart mixer Keysight E8267D PSG vector signal generator Keysight DS0z634A amp Infiniium oscilloscope with 89600 VSA software Keysight M8190A arbitrary waveform generator Keysight M9703A high speed digitizer wideband digital receiver Jannar e binnan a a E Keysight MIMO PXI test solution M9381A PXI VSG and M9391A PXI VSA Up to
2. EVALUATION ENGINEERING evaluationengineering com EDITORIAL EXECUTIVE EDITOR Rick Nelson e mail rnelson evaluationengineering com MANAGING EDITOR Deborah Beebe e mail doeebe evaluationengineering com SENIOR TECHNICAL EDITOR Tom Lecklider e mail tlecklider evaluationengineering com PRODUCTION PRINT WEB COORDINATORS Emily Baatz e mail ebaatz npcomm com PRINT WEB COORDINATORS Guy Vilt e mail gvilt npcomm com AD CONTRACTS MANAGER Laura Moulton e mail Imoulton npcomm com AD TRAFFIC MANAGER Denise Mathews e mail dmathews npcomm com BUSINESS PRESIDENT Kristine Russell e mail krussell npcomm com PUBLISHER Jim Russell e mail jrussell npcomm com ASSOCIATE PUBLISHER Michael Hughes e mail mhughes evaluationengineering com MARKETING DIRECTOR Joan Sutherland ADVERTISING WEST Michael Hughes Phone 805 529 6790 e mail mhughes evaluationengineering com EAST Blake Holton or Michelle Holton Phone 407 971 6286 or 407 971 8558 e mail bholton cfl rr com mmholton cfl rr com CIRCULATION SUBSCRIPTIONS BACK ISSUES e mail subscriptions npcomm com LIST RENTALS Laura Moulton e mail Imoulton npcomm com EPRODUCT COORDINATOR Mary Haberstroh e mail mhaberstroh npcomm com REPRINTS Deborah Beebe e mail dbeebe npcomm com EE EVALUATION ENGINEERING is available by free subscription to qualified managers supervisors and engineers in the electronics and related industries FOUNDER A VERNER NELSON e mail vnelso
3. First the acquisition mode of the oscilloscope is changed from Normal capture to High Resolution capture mode Second a frequency measurement is selected from the list of possible measurements by pressing the Measure button A middle threshold for carrier zero crossing detection is set to 30 mV given that the swing of the carrier signal is from around 316 mV to 316 mV 1 mW signal 0 dBm into 50 Q Then the Math key is pressed and a math function called measurement trend is chosen Markers are assigned to have their source be the math function result An interesting view of frequency measurements taken across the RF pulse can be seen in Figure 6 Clearly the pulse carrier is shifting in a linear fashion across the pulse from left to right as designed Notice that the linear ramp display is not going across the entire width of the RF pulse This is because the 1 000 measurement limit in the trend calculation has been reached It is important that a portion of the pulse FM function can be seen and it is lin ear For the frequency measurements across the pulse to have enough precision it was imperative that the High Resolution acquisition mode was selected Summary FFTs in oscilloscopes are a valuable tool to give a frequency domain view of a signal This can ultimately be done with very wide bandwidth enabling measurements not possible with a narrower band vector signal analyzer Example FFT measurements were able to verify that a
4. the use of the FED reduces the number of truck rolls needed to change the state of the far end of the circuit when per forming measurements to assess the copper circuit quality The EXFO Max Tester 600 remotely controls the FED instructing it to place short open or any other terminations at the far end of the copper pair circuit to properly con duct measurements Malcom Basell CEO Teletech Pty Ltd said in a press release The Teletech TS125 Remote FED perfectly complements EXFO s MaxTester 600 series and extends the range of copper pair quality tests by removing the need for repeated travels to the far end of the line When completing tests the Max Tester automatically controls the TS125 to ensure the line is always terminated correctly By leveraging Teletech s reliable ex pertise with FEDs EXFO now is poised at a vantage point in the industry to provide a fully comprehensive solution for copper pair quality testing said Etienne Gagnon vice president Physi cal Layer and Wireless Division EE Reference 1 The State of Virtualization for Visibility Architectures Ixia Research Report March 2015 AAV KEYSIGHT 34470A 712 Digit Multimeter Eion Range Aperture Auto Zero InputZ OCW Ratio Clear Time Off Auta r Peaks Truevolt DMMs for your next generation of insights As the industry leader in bench digital multimeters DMMs Keysight delivers more than numbers We empower insi
5. The turning point occurred when as Sayler recounted We were approached by one of our major customers that want ed us to build everything including the software necessary to make wireless OTA measurements for cell phones And as they say the rest is history The cell phone work was successfully completed resulting in the initial version of ETS EMQuest wireless test software A few years later the TILE Program was redeveloped as a comprehensive test ex ecutive specifically for EMC engineers Today the opportunities that ETS pur sues often result from its capabilities in both the wireless and EMC fields For example Sayler described the erowth ETS currently is experiencing in Asia the most rapidly growing of the international areas making up about 45 of the company s sales Some of the infrastructure investments aid product research and development But on the EMC side Sayler said test facilities are being built so that companies can do their own testing inhouse avoiding the delays associated with a U S or Euro pean lab He said In China in particu lar that s the kind of cycle that we re in now A lot of companies are building their own chambers to be able to do good product development and export beyond just that market Using either the TILE Software for EMC or the EM Quest software for wireless we re able to provide a complete end to end solution for a customer To support incre
6. bandwidth for the application The carrier frequency of a signal of interest also is important The carrier frequency of the signal under test plus half the spectral width of that signal must be less than or equal to the os cilloscope bandwidth for the oscilloscope to be used on its own for the measurement A wide band signal frequency domain measurement will now be considered The signal under test is a 600 MHz RF pulse ee OTS oe PN TIS _ __ _ AW KEYSIGHT intiniiVision MSO X 31047 taxes sipsi Onitoncope 1GHs sasar mesa Z pom RF MICROWAVE TEST train with 4 us wide RF pulses repeating every 20 us There is a linear frequency modulation of the signal that chirps the carrier frequency from 300 MHz at the start of the RF pulse envelope to 900 MHz at the end of the pulse envelope To make a basic FFT measurement of the RF pulse the first step is to get a clean time domain capture of a pulse from the signal on screen The scope is reset to a known condition by pressing Default Setup Then Auto Scale is pressed and the time division setting is adjusted to bring one main RF pulse on screen The basic default rising edge trigger is further qualified with trigger holdoff This ensures that a trigger doesn t happen mid pulse since that would create instability in the captured trace The trigger holdoff is set to something slightly longer than the width of the RF pulse The RF pulse is 4 us wide
7. lt gt i Communications Inc Communications service providers look to test solutions By Rick Nelson Executive Editor ireless and landline telecommunications companies We service providers face significant challenges in rolling out maintaining and upgrading their net works and infrastructure to support multiple data communi cation standards while maintaining the highest levels of quality for voice and data traffic So too do enterprises maintaining their own networks They need assistance in the form of instru mentation software and services Companies are facing particular challenges contending with virtualization and network transition Consequently virtual probes are helping to maintain visibility Other products that companies can use range from protocol analyzers and emulators to handheld instruments that remain invaluable when a techni cian needs to track a problem down to a particular copper wire and the handhelds are getting a boost from cloud computing New approach to service assurance For the communications services providers CSPs subscriber experience is paramount said Karen Emery vice president of product and business strategy at the Spirent Communications Service Assurance Business Unit Their end customers demand anytime anywhere any device services and high quality is table stakes Their demand for the latest capabilities is almost insatia ble To meet this demand the CSPs are chan
8. ment that is useful and preferred by the customer we ll integrate that into our system Continuing with the theme of system integration the company s recently in troduced line of amplifiers has been well 40 evaluationengineering com June 2015 BRYAN SAYLER Vice President Solutions Development ETS Lindgren received according to Sayler He elabo rated We don t specify our amplifiers the same way that other companies do We don t talk as much about output pow er because output power is useful only if you need it What we talk about instead is the delivered field strength He con tinued We have control over the design optimization of the amplifier and the chamber If your chamber isn t designed well you can get a lot of reflections that will have an impact on your system By designing a better chamber and a great antenna we re able to do more with less in terms of the amplifier size Perhaps the largest current opportu nity is in the automotive industry where EMC and wireless are converging Sayler described the use of as many as 20 or 30 antennas in a high end car to deal with satellite radio LTE tire pressure moni toring and front and rear radar colli sion avoidance systems He explained We ve set up a group inside ETS Lind gren to focus specifically on this because the way an automotive company thinks about their antennas is different from the way a cell phone company
9. performance of the device during immunity testing and supply a copy of the instructions for use and accompanying documents for review per Section 5 A checklist of technical changes The normative references to the basic standards were updated triggering some technical changes on top of the standard s ac tual modifications Here is a checklist of updates e Connector pins need to be tested for ESD if they are accessible by the standard test finger e Immunity testing of DC inputs now is required and 12 VDC inputs must be surge tested e The test levels for magnetic field immunity on medical prod ucts are increased to 30 A m e Voltage dips and variations now are synchronized at 45 degree increments of the AC line e Fast transient immunity tests must be performed at a 100 kHz repetition rate instead of a 5 kHz rate e Conducted immunity levels are increased from 3 Vrms to 6 Vrms in the ISM frequency bands e Radiated immunity is specified to 2 7 GHz instead of 2 5 GHz and modulation now is 1 kHz in line with requirements in simi lar EMC standards e ESD immunity levels are increased significantly to 8 kV contact to metal surfaces and 15 kV air discharge to plastic nonconduc tive surfaces e A new wireless coexistence test increases the radiated im munity test levels to 28 V m at spot frequencies from 385 MHz to 5 8 GHz per Table 9 These levels are increased to assess the product s susceptibility to interference from c
10. relative humidity and pH and transmits the data to June 2015 a smartphone or tablet via wireless Bluetooth communication from the free UWBT app running on an iOS or Android smart phone tablet The company also recently debuted the PXSO9HL Series industrial differential pressure transducers specifically designed to provide long life in demanding industrial areas e Texas Instruments is offering its MSP430i202x mixed signal microcontroller through Mouser Electronics for applications in cluding smart meters power monitoring and control and preci sion sensors e Analog Devices recently announced that Elster has selected ADI s ADF7241 smart metering solution for use in gas and elec tricity meters that Elster is designing as part of a nationwide en ergy efficiency initiative sponsored by the British government e Linear Technology said its SmartMesh IP on chip software de velopment kit enables users to develop C code applications for execution on SmartMesh IP motes wireless sensor nodes Keynote presentations This year s conference will include two keynote speakers First Dr Mike North the host of Discovery Channel s Prototype This Outrageous Acts of Science and In The Making will present a talk titled Your Sixth Sense of Innovation on Wednesday June 10 at 9 a m The sensors market is poised for explosive growth in 2015 and beyond he said in a press release To keep pace with this rapid
11. vice globally in 2011 This rapid capacity growth is driven by a changing mix of global network operators Private networks particularly those of large content providers account for a growing share of in ternational bandwidth even surpassing Internet bandwidth on the trans Atlantic route last year Consequently network operation has become a core part of the business for some of the largest content providers USI stylus will work across multiple devices platforms Prominent OEMs as well as stylus and touch controller manu facturers have announced the launch of Universal Stylus Ini tiative USI an organization formed to develop and promote an industry specification for an active stylus The USI specification will make it possible for manufactur ers to design products to a single standard rather than the variety of proprietary approaches now in use and it will be compatible with current notebook computer operating system requirements USI seeks to provide a consistent user experi ence while increasing the availability and consumer appeal of the active stylus through providing industry wide interoper ability and adding functions and features not supported by current styluses Navajo students win Schoolyard STEM Lab Samsung and the National Environmental Education Founda tion NEEF awarded the first ever Schoolyard STEM Lab to the students and teachers of Nizhoni Elementary School in Shiprock NM in celebration of the 10th a
12. 10 5 3 s Fi a El a 3 1 2 500m 300m 200m 100m INSTRUMENTATION Level dBFS 100 110 120 130 140 150 160 60k 80k 100k 120k 140k 160k 120k 200k Frequency Hz Figure 10 ADC C anti alias filter OOB rejection Level dBrBi du 110 120 20k 40k 60k BOk 100k 120k 140k Frequency Hz Figure 11 ADC B anti alias filter OOB rejection for jitter sidebands which are symmetrical around the stimu lus tone In Figures 7 and 8 DAC C shows strong sidebands while DAC B shows none Note that the strong tones at 20 kHz and 30 kHz are products of harmonic distortion and not jitter sidebands Jitter tolerance template AES3 describes a jitter tolerance test where the capability of a receiver to tolerate defined levels of interface jitter on its input is examined A digital audio signal is applied to the input The signal is jittered with sinusoidal jitter swept from 100 Hz to 100 kHz As the jitter is swept its level is varied according to the AES3 jitter tolerance template Jitter is set at a high level up to 200 Hz then reduced to a lower level by 8 kHz where it is maintained until the end of the sweep An interface data receiver should correctly decode an in coming data stream with any sinusoidal jitter defined by the jitter tolerance template of Figure 9 The template requires a jitter tolerance of 0 25 unit interval UI peak to peak at high frequencies increasing with the inv
13. 8x8 phase coherent Keysight N5152A 5 GHz 60 GHz upconverter MIMO measurements Keysight N1999A 60 GHz 5 GHz downconverter Keysight N5247A PNA X microwave network analyzer 67 GHz KEYSIGHT TECHNOLOGIES Unlocking Measurement Insights INDUSTRY UPDATE For more on these and other news items visit www evaluationengineering com category industry update Enterprise augmented reality app market to grow tenfold by 2019 Juniper Research predicts that augmented reality AR tech nology used in the enterprise will drive annual app revenues of 2 4 billion in 2019 up from 247 million in 2014 The research notes that enterprise interest in AR has reached new heights owing to improvements in software wearable technology and the promise of significant efficiency gains However the individual needs of enterprises dictate that AR app costs will remain high for the foreseeable future Despite a high revenue forecast for the sector the research Augmented Reality Consumer Enterprise amp Vehicles 2015 2019 observed that the overall uptake of enterprise AR applications will remain relatively low until the end of the decade TeleGeography says global network construction resurges New data from TeleGeography s Global Bandwidth Research Service reveals that international bandwidth grew 44 in 2014 to reach 211 Tb s The 65 Tb s of new capacity deployed in 2014 is comparable to nearly the entire amount of bandwidth in ser
14. E3 OC 3 12 STM 1 4 and wireless applications many centered around the company s Message Automation amp Proto col Simulation MAPS platform MAPS supports emulation of Mobile Application Part MAP an application layer protocol used in core networks to provide services to mobile users as well as other protocols and interfaces Speaking of the company s recently announced Enhanced GSM Protocol Test Suite Jagdish Vadalia a senior manager for product development said in a press release The Global System for Mobile GSM is the global standard for mobile voice and data communications adding GL has solutions for the analysis and emulation of entire GSM network in terfaces The suite includes the company s GSM protocol analyzer as well as protocol emulators GL s MAPS MAP supports emulation of all the GSM and UMTS MAP inter faces he said He added The test suite also provides GSM network monitoring capability on the TDM network and the analyzer monitors calls progressing through GSM networks from a cen tral location via a web interface along with the powerful and customizable reporting tools The GSM protocol analyzer also supports GSM R a proven European mobile communications standard for railway operations used to carry railway specific voice and data services according to EIRENE H 22 T 0001 2 and ETSI TS 102 610 specifications Figure 2 GL also has debuted its GSM Network Surveillance softwar
15. LCR Meter Options Three low frequency options for the E4982A LCR me ter enable RF inductor coil and EMI filter manufacturers to perform impedance testing at various frequencies Today s smartphones and other electronic equipment often utilize components such as inductors and EMI filters Ensuring these passive components operate as expected in the real world requires impedance testing during production as well as dur ing quality assurance The options cover the 1 MHz to 300 MHz Opt 030 500 MHz Opt 050 and 1 GHz Opt 100 frequency ranges These new frequency range options complement the E4982A s ex isting 3 GHz measurement capability Opt 300 Frequency upgrade options also are available The low frequency options base prices are as follows E4982A 030 1 MHz to 300 MHz 16 012 E4982A 050 1 MHz to 500 MHz 18 801 and E4982A 100 1 MHz to 1 GHz 27 375 Keysight Technologies www rsleads com 506ee 206 Source Measure Unit A new addition to the GS820 source measure units all of which feature isolated two channel source and measurement functions is able to source up to 50 V and 0 6 A DC The SMUs offer four quadrant operation consisting of current source and current sink operation On the 50 V model voltage rang es are 200 mV 2 V 20 V and 50 V Current ranges are select able from 200 nAto 1A Applications for these source measure units include tests for LED lighting and the generation of I V curve tr
16. O 2 counters mccdaq com J at aG MEASUREMENT COMPUTING Contact us 2015 Measurement Computing Corporation info mccdaq com Visit www rsleads com 506ee 006 16 evaluationengineering com P SPECIAL REPORT ae A Pi a A Aa A a A al A A a AA a 4a aa ar 2 Figure 4 Mask testing on RTO 1044 Model DSO Courtesy of Rohde amp Schwarz many scopes The more specialized com munications buses and aviation buses such as MIL STD 1553 and ARINC 429 generally are options As Tek s Loberg explained Serial bus decoding tools enable the engineer to identify where control and data packets begin and end as well as identify subpacket compo nents such as address data CRC etc LeCroy s DDR Debug Toolkit extends the company s serial data analysis capa bilities by correctly computing DDR jit ter even though the signals are bursted Jitter parameters including Tj Rj and Dj are calculated across all active mea surement scenarios Time interval error TIE histograms TIE track and bathtub curves are displayed Measurements and masks Mask testing was mentioned by a few companies Figure 4 Teradyne s Randy Oltman instrument product line direc tor said that for well known or ex pected behavior limit and mask tests can provide a simple go no go test A unique capability of Teradyne s ZT Series in struments is automatic mask generation which uses a golden wav
17. as they use an embedded clock signal as the time reference Therefore clock data recovery CDR is required to extract the frequency and phase information of the embedded clock out of the data signal With the option R amp S RTO K13 clock data recovery is done directly in hardware and real time This enables triggering on the embedded clock as well as fast histogram and eye mask testing on high speed serial data signals with embedded clock The company s Markley added Because eye patterns are sta tistical in nature doing the clock recovery in hardware greatly increases our chances of finding outliers and infrequent events that a software based CDR may miss A very large number of serial bus standards are supported depending on the particular scope model Serial triggering and decoding for low speed buses are included as standard on Automated Systems PV Inverter ATE 17020 Battery Charge Discharge Tester s Switching Power Supply ATE Custom Test Fixtures Automated Test Systems Over 5 000 in the Field and Growing Systems Platform Designed as a complete solution for all types of power conversion testing our C8000 automated test platform rolled out in 2001 Since then over 5 000 systems have been deployed in the field globally The C8000 s success can be attributed to its seamless integration with a wide range of commercial off the shelf equipment Its broad range of use combined with Pow
18. cutting edge IP Code capa bilities up to IP69K CertifiGroup Visit www rsleads com 506ee 362 of all ba z pa Te peany DUES TANE FILEF TTT Mala la do i EE PRODUCT PICKS USB 3 1 Test Suite The QOPHY USB3 1 Tx a Rx package performs au Lam J tomated USB 3 1 transmit ee a ter Tx and receiver Rx A compliance testing char acterization and debug creating a comprehensive USB 3 1 test suite With the new test package USB 3 1 testing can be conducted on both Gen1 5 Gb s and Gen2 10 Gb s devices under test according to the latest USB 3 1 specifications Tx testing is performed us ing a high bandwidth 16 GHz oscilloscope while Rx testing uses the Protocol Enabled Receiver and Transmitter Toler ance Tester PeRT3 The new QPHY USB3 1 Tx Rx software leverages the QualiPHY automated test framework which provides connection diagrams automated oscilloscope op eration and report generation OPHY USB3 1 Tx Rx is available for 8 000 Oscilloscopes capable of testing USB 3 1 start at 158 900 and a PeRT3 ca pable of testing USB 3 1 starts at 182 000 Teledyne LeCroy www rsleads com 506ee 208 40 GHz RF SOI Switch The UltraCMOS PE42524 RF SOI silicon on insulator switch operates up to 40 GHz significantly extending the ven dor s high frequency portfolio into frequencies previously dominated by gallium arsenide GaAs technology As an al ternative to GaAs based solutions the PE42
19. first across the full signal bandwidth then across a limited bandwidth then with an added weighting filter e 120 3 dB rms noise DC to 48 kHz e 123 9 dB rms noise 20 Hz to 20 kHz e 126 2 dB rms noise 20 Hz to 20 kHz A weighted But if you look at the FFT spectrum shown in Figure 4 the average noise floor appears to be about 163 dB or so That s a big difference What s up Conventionally an audio FFT amplitude spectrum is dis played by scaling the vertical axis so that a bin peak indicates a value that corresponds to the amplitude of any discrete frequency components within the bin This calibration is not appropriate for measuring broadband signals such as noise power without applying a conversion factor that depends on the bin width and on the FFT window used In this case each bin is 0 375 Hz wide sample rate of 96 kS s divided by an FFT length of 256k points The window spreads the energy from the signal compo nent at any discrete frequency and the Y axis calibration takes this windowing into account For the AP Equiripple win dow used here the calibration compensates for the power being spread over a bandwidth of 2 63 bins This can be converted to the power in a 1 Hz bandwidth or the power density by adding a scaling factor in decibels that can be calculated as follows scaling factor 10log 1 window scaling x bin width 10log 1 2 63 x 0 375 4 2 dB To estimate the noise from a device based on an FFT s
20. linear FM chirp sig nal was shifting the carrier frequency as it should There also was a place for other math functions namely the measure ment trend function In this example such a calculation al lowed for a very simple verification of a linear FM chirp EE About the author Brad Frieden is a product planner product marketing engineer for the Oscilloscopes and Protocol Division of Keysight Technologies He has been with HP Agilent Keysight for 30 years and involved in a variety of marketing roles in areas including fiber optic test pulse generators oscilloscopes and logic analyzers Frieden received a B S E E from Texas Tech in 1981 and an M S E E from the University of Texas at Austin in 1991 without limits SEMICON West is brought to you by w APPLIED MATERIALS KLA Tencor Lam RESEARCH A 63 HOURS of Technical Programs 650 Exhibitors Ap semi www semiconwest org The Marketplace for Microelectronics Innovation JULY 14 16 SEMICON MOSCONE CENTER WestZ20 5 SAN Francisco SEMICON West is the premier destination for the people products and companies driving the future of microelectronics design and manufacturing and is the global marketplace for microelectronics innovation Program Topics General Industry forecasts and business outlook Update on 450 mm lol opportunties and challenges for semiconductor manufacturing Industrial lol and 3D printing
21. membership on technical roadmaps to build out the Industrial Internet a network of intelligent devices and sen sors between which data can be exchanged via different con nectivity protocols to drive productivity enhancements across a wide range of end market applications YOKOGAWA lt gt Test amp Measurement i More Channels a More Sensors When 4 channels were not enough Yokogawa delivered the world s first 8 channel oscilloscope Engineers facing challenges in the embedded electronics automotive power and mechatronic industries will find their solution in the DLM4000 Mixed Signal Oscilloscope e Eight analog channels and up to 24 bit logic input e Four simultaneous serial bus triggers and analysis e Bandwidth of 350 MHz or 500 MHz e Deep memory up to 250 Mpts ch Sampling rate up to 2 5 GS s 12 evaluationengineering com Jad eS el me OSCILLOSCOPES Sponsored by ROHDE amp SCHWARZ Increased insight through innovative technology By Tom Lecklider Senior Technical Editor ow does your scope answer this question What s Hee with this signal Typically that s the question users want to ask but it s not always easy to make a scope understand what you want it to do Because oscilloscope controls affect vertical sensitivity horizontal sweep speed and several trigger modes some translation generally is needed When we asked scope manufacturers the same question they responded with a ra
22. so a trigger holdoff of 5 us works well Next the FFT button is pressed to calculate a spectral view of the RF pulse train from the time domain digitized signal on screen There are FFT controls for start and stop frequency or center frequency and span A wide span is first chosen with a start frequency of 0 Hz and a stop frequency of 2 5 GHz Since this is a pulse signal and an entire pulse can be placed on screen with only noise on the left and right side of the scope screen a rectangular window is chosen for the FFT calculation FFT av eraging with a count of eight also helps optimize the measure ment result The FFT response that results is shown in Figure 4 Markers are placed on the FFT response and it can be seen that this RF pulse does have a wide spectral width from 300 MHz to 900 MHz or 600 MHz wide What s not yet proven is that the fre quency of the carrier shifts from 300 MHz to 900 MHz linearly from the left side of the pulse across to the right side of the pulse The gated FFT math function One way to quickly see some carrier frequency values across the pulse is to use the gated FFT function This is achieved by turning on the normal time domain trace time gating function This func tion generates a normal trace view at the top half of screen and a magnified view at the bottom of the screen The time division control expands and shrinks the time gate window placed on the upper normal trace and the time delay control m
23. the problem is fixed An FFT spectral view also is helpful when looking at more complex wide spectral signals to verify if the proper modulation is happening Time gated FFTs further evaluate spectral components of a signal Math functions such as a frequency trend can quickly verify whether a classic modu lation scheme is happening properly like a linear frequency modulation across pulses in a stream This article will ex plore a number of these examples and look at practical con siderations for the measurements I the process of debugging and validating both digital and FFT measurement with an input sine wave An oscilloscope that has a 1 GHz analog bandwidth and up to a 5 GS s sample rate will be used for measurements These are both important specifications that will tie into what kinds of measurement applications are possible The first example mea surement is the capture of a 600 MHz 632 mV p p 0 dBm 1 mW sine wave signal into 50 Q orange and resultant FFT white as shown in Figure 1 It s important to understand how the oscilloscope sampling characteristics play into the quality of this FFT measurement The oscilloscope analog bandwidth sample rate memory depth and related time capture period all can have a profound effect on the measurement result This effect is heavily influ enced by the characteristics of the signal under test and how those signal characteristics are related to the oscilloscope cap ture perform
24. will not Serenity Caldwell at iMore offers the idea of a re placeable core you take your 15 000 watch into the Apple store every 18 months for an upgrade But I suspect the appeal of an expensive analog watch is the intri cate accurate and timeless meaning already obsolete internal mechanism and the craftsmanship that went into it In fact makers of luxury analog brands don t seem worried about competition from Apple Jean Claude Biver president of LVMH s watch division and CEO of its Tag Heuer brand was quoted in the Wall Street Journal as saying he doesn t be lieve the Apple Watch will affect the sales of high end mechanical watches saying someone buys a 20 000 watch because it s a piece of art not to tell you the time Nevertheless Tag Heuer is hedging its bets and collaborating with Google and Intel on the development of a smart watch It will be interesting to see whether Apple can solve the silicon obsolescence problem and establish its watch as an heirloom that can be handed down from generation to generation In fact Apple might get some help from Moore s Law Writing in the April issue of IEEE Spectrum Andrew Bunnie Huang says that as Mootre s Law slows we can anticipate keeping electronics products for more than a few years Consequently we may focus more on fashion and packaging issues than on the technology inside Although the idea of an heirloom laptop sounds preposterous today he writes t
25. with extensive set up dia grams and instructions is included with each unit Teseq www rsleads com 506ee 202 Real Time Spectrum Analyzer The compact RTSA7500 real time spectrum analyzer ana lyzes wireless signals in real time The RTSA7500 has the standard features of a sophisticated expensive benchtop spectrum analyzer but at lower cost since it uses the display and processing power of an attached PC Frequency con trols marker functions for tracking specific frequencies and multitrace functionality are all included as well as real time triggering for measuring complex data signals such as Wi Fi and LTE FPGA based digital signal processing within the RTSA7500 enables the capture of elusive time varying sig nals across an instantaneous bandwidth of up to 100 MHz The instrument is manufactured by Berkeley Nucleonics Saelig www rsleads com 506ee 203 June 2015 DAQ Controller A new CompactDAO eight slot controller expands the CompactDAO controller offering to meet high channel count applications in rugged environments By integrating the pro cessor signal conditioning and I O into a single Compact DAO system engineers can decrease overall system cost and complexity while increasing measurement accuracy Integrat ed measurement systems reduce the number of components connections and wiring needed which often introduce noise and additional costs to ensure high accuracy measurements and cost optimized systems Both
26. would think about their antennas but they have the same problem Sayler is in a unique position to under stand and respond to customer needs being responsible for identifying market trends developing specific solutions and implementing them via a project management team that handles all as pects from cradle to grave In addition to Sayler ETS has separate manufactur ing and sales managers also with world wide responsibilities Within ETS marketing s role as Say ler described it is to help connect our customers to our capabilities Most of the time our customers don t fully appreci ate all of the things that ETS Lindgren can do They either think of us as a shielding company or as a software com pany or as an antenna company Mar keting s job really is to help customers grasp the totality of what ETS Lindgren can do for them EE 2 GHz Clock Generator CG635 2995 us iisi ome MODIFY ay patties rae M D aTe e ah A CMO CAMEL ase ew A ALI E HoH IHIET Paar BL aa GH AN pan tow to Fe ae ae l T B 9 bes Vv nt ma F pier T gt a vi STEP peer E cmo5 4 5 6 our a lt a ee aoe A _ Ganid Ea HE y p eae a ie a Lie E a a MODEL CGA LINE RECEIVER Square wave clocks from DC to 2 05 GHz The CG635 generates clock signals flawlessly The clock signals a
27. 000 com 30 Yokogawa Corp of America tmi yokogawa com 11 This index is provided as a service The publisher does not assume liability for errors or omissions June 2015 evaluationengineering com 39 EXECUTIVE INSIGHT By Tom Lecklider Senior Technical Editor Managing EMC and wireless test Bryan Sayler a 27 year veteran of the EMC industry is vice president for solu tions development at ETS Lindgren with duties that include identifying marketing trends for the company He started his EMC career with Rayproof a pioneering anechoic chamber and absorber com pany Initially Sayler managed anechoic chamber manufacturing eventually hav ing responsibility for shielding as well Several years later Escorp bought Ray proof and combined it with Rantech and the Electromechanics Company EMCO both already owned by Escorp to create EMC Test Systems or ETS In 2000 the Lindgren company was added forming the present ETS Lindgren As Sayler explained during an in terview at the recent IEEE Electro magnetic Compatibility and Signal Integrity Symposium the basis of the company through about 2000 2001 had always been shielding and absorbers of ten combined in chambers The Lindgren company brought with it very interesting new MRI and electron microscope appli cations but shielding remained central Of course forming ETS Lindgren inte grated not just the two groups of prod ucts but also the company cultures
28. 524 features high reliability and performance advantages in linearity isolation settling time and ESD protection These attributes make the switch suitable for test and measurement microwave back haul radar and military communications devices Peregrine Semiconductor www rsleads com 506ee 210 Index of Advertisers ADVERTISER PAGE Advanced Test Equipment Rentals www atecorp com 25 AR RF Microwave Instrumentation www arworld us anotherFirst 1 AR RF Microwave Instrumentation http bit ly amplifierfundamentals 39 CertifiGroup www CertifiGroup com 39 CHROMA Systems Solutions Inc chromausa com 15 Data Translation www datatranslation com 17 Educated Design amp Development Inc www ProductSafet com 39 Keysight Technologies www keysight com find PAM 4 insight 6 7 Keysight Technologies www keysight com find 5G Insight 8 9 Keysight Technologies www keysight com find SeeT heWork 13 Keysight Technologies www testequity com Agilent_DMM 21 Keysight Technologies www keysight com find triggerchallenge 27 Marvin Test Solutions marvintest com BC Measurement Computing Corp www mccdag com 16 National Instruments ni com automated test platform 3 Pickering Interfaces Inc www pickeringtest com ebirst 5 Precision Filters www pfinc com IFC Saelig Company Inc www saelig com 20 SEMICON West 2015 Www semiconwest org 31 Sensors Expo amp Conference Www sensorsexpo com 33 Stanford Research Systems www thinkSRS com IBC Vibration Test Systems www VTS2
29. AIII CompleteLinQ and Optical LinQ provide a set of tools for advanced analysis A new PAM 4 package supports real time oscilloscope analysis of systems using PAM 4 signaling These capabilities coupled with the performance enhancements make the 10 Zi A suitable for engineers designing next generation high speed electrical and optical links The updated WaveMaster 8 Zi B enhances the capabilities of its predecessor with lower noise higher sampling rates deep er acquisition memory and the next generation of Teledyne LeCroy s MAUI oscilloscope user interface SDA 8 Zi B Serial Data Analyzer models are specifically configured for testing to day s high speed electronics systems with an advanced eye and jitter analysis toolkit additional acquisition memory and a true hardware serial data trigger When coupled with Teledyne LeCroy s standard specific analysis options the SDA 8Zi B is suit able for testing characterizing and debugging USB 3 1 PCI Express DDR memory MIPI M PHY and D PHY and other applications The U S list prices for the 10 Zi A system start at 215 885 10 Zi A systems include either an MCM Zi A or SDA MCM Zi A along with at least one acquisition module and are available with bandwidths ranging from 20 GHz to 100 GHz Delivery time is approximately six to eight weeks ARO WaveMaster 8 Zi B and SDA 8 Zi B oscilloscopes are available with band widths ranging from 4 GHz to 30 GHz WaveMaster 8 Zi B US list prices st
30. And Digital Vibration Controllers SINCE 1974 NEW Digital Vibration Controllers Programmed for Windows Operation Includes Expansion Card and Software Package to convert your PC to a Digital Vibration Controller computer not included 100 lbf Systems 7 410 150 lbf Systems 11 014 NEW 4 Channel Swept Sine VTS Systems Include Random amp Classical Shock with Built In Current Sources 7 990 Sine 5 995 Random 5 995 e Vibrator With Trunnion Base e Blower For Vibrator Cooling e Low distortion Linear Amplifier with built in Fan Please download demo disk from our website Demonstrates Programming amp Controller Operation VTS VIBRATION TEST SYSTEMS 10246 CLIPPER COVE AURORA OHIO 44202 330 562 5729 Fax 330 562 1186 www VTS2000 com e All Interconnecting Cables amp Hose Vibration Systems for modal testing research and development product qualification vibration screening and vibration demonstration Made in the U S A Visit www rsleads com 506ee 012 June 2015 AV KEYSIGHT InfintiVision MSO X 3104T Mixed Signal Oscitoscope 1GHr 5GSa s meca Zoom Figure 6 Measurement trend math function on frequency measure ments across the pulse is able to display up to 1 000 measurements in a trend for mat In a similar signal example a 600 ns wide pulse train repeating every 20 us needs to be verified The FFT function now is turned off and purely time domain measurements are made
31. E Reference 1 Lecklider T Resolving Finer Detail EE Evaluation Engineering July 2013 pp 8 12 Data Acquisition Modules ABCs of Measuring Any Sensor More than 150 Modules Supported by QuickDAQ Data Logging and FFT Analysis Software O Low Cost The ECONseries is an economical series of multifunction data acquisition modules that run off USB power for true portability e 71 l anon a am 3 l U a soo cee Be Pitieceana om ceoaP 7 4 High ERSE E s Performance a ES a The DT9836 is one of tpt Sie a ais oho she ote oka sin ote este asim 8 Series of isolated simultaneous analog Sa input boards that offer aa high performance at up to 1OMHz channel Res pT9824 Precision mimaa E ISO Channel USB Data Acquistion Module i ET 3 aie pema i i r8 mca EHR aw ATA TAIN SL arrow ed lt lt Highest Precision Direct Connect The DT9824 offers the highest stability and accuracy for measuring analog signals Accuracy to 10ppm and galvanic isolation to 500V 800 525 8528 WWW DATATRANSLATION COM The DT9829 measures sensor parameters directly with no signal conditioning This includes strain temperature and voltage It is isolated to 500V for clean signal measurement DATA TRANSLATION Visit www rsleads com 506ee 003 18 evaluationengineering com Se eee REMOTE MONITORING N 4 N Sponsored by
32. EVALUATION ENGINEERING Oscilloscopes Increased insight through innovative technology Remote Monitoring Communications service providers look to test solutions www evaluationengineering com JUNE 2015 Written by Engineers for Engineers SENSORS Convergence drives sensor proliferation MEDICAL TEST Strict EMC rules aim for secure healthcare environment 1 a 5 1 8 s F j os _ An F A 18 E F m del tested in NASA Langley aarch Center s Transoni namics Tunnel When every minute counts you can t afford unnecessary downtime Off site calibration means weeks of lost productivity Manual pretest verification is tedious and time consuming Precision s high performance transducer conditioning system allows you to perform NIST traceable calibration tests on site The industry s only automated go no go status report guarantees test performance every time PRECISION FILTERS INC Confidence to push the button Transducer Conditioning Systems Filter Amplifier Systems Signal Switching Systems Learn more at www pfinc com call 607 277 3550 or email sales pfinc com Visit www rsleads com 506ee 014 Another First From AR zy 7 il i r ay yr h et he ie k peana l ad F i af we ri k S ih Afi i k n he i Ya i r d st ry Building Upon Success With Our New 3000 Watt CW 1 2 5 GH Solid State Amplifier Solid State Class A power from the Industry Leader provides you with the pe
33. Joachim Peerlings marketing man ager of Keysight s Digital and Photonic Test Division in a press release We designed the 81606A tunable laser source with that goal in mind An innovative autonomous wavelength refer ence unit and a new cavity design push current benchmarks for measurement accuracy dynamic range and test time while ensuring the highest long term stability and enabling cost effi cient servicing Oscilloscope enhancements Teledyne LeCroy chose the OFC to announce enhancements to the two highest performance oscilloscope product lines in the company s portfolio Figure 2 The new 10 Zi A delivers improved performance in effective number of bits and baseline noise The WaveMaster 8 Zi B features increased sample rate lower noise enhanced processing capabilities and the latest version of Teledyne LeCroy s advanced oscilloscope user inter face MAUI Figure 2 10 Zi A and 8 Zi B oscilloscopes Courtesy of Teledyne LeCroy The 10 Zi A builds on the 10 Zi oscilloscope series The new models include improvements in signal fidelity and noise per formance while maintaining performance with respect to band width 100 GHz sample rate 240 GS s and intrinsic sample clock jitter 50 fs The 10 Zi A s modular ChannelSync architecture lets users build oscilloscopes with up to 80 channels with better than 130 fs channel to channel jitter Serial data and optical modulation measurement toolkits including SD
34. No generator protocol analyzer DVM and counter Get in touch Triggering with the future of scopes Take the Trigger Challenge today Sample Rate 5 GSa s 2 5 GSa s gt 500 MHz 5 GSa s 1 GHz KEYSIGHT TECHNOLOGIES Take the Trigger Challenge at www keysight com find triggerchallenge USA 800 829 4444 CAN 877 894 4414 Unlocking Measurement Insights Keysight Technologies Inc 2015 Refer to Keysight document 5992 0140EN for product specs and 5989 7885EN for update rate measurements Competitive oscilloscopes are from Tektronix publication 48W 30020 3 Agilent s Electronic Measurement Group is now Keysight Technologies 28 evaluationengineering com H RF MICROWAVE TEST Scope FFT and waveform math functions take on RF measurements By Brad Frieden Keysight Technologies RF designs the oscilloscope Fast Fourier Transform FFT function and a variety of other math functions can prove valuable to designers moving beyond the prototype stage and into production For example with digital designs the FFT function in an oscilloscope can quickly highlight the frequency content of signals that are making their way onto power supply rails and further pinpoint the source of such noise signals with that knowledge That s important because such signals can translate into noise in other parts of the design cutting signal margins and potentially preventing the design from moving be yond the prototype stage until
35. SNR and SINAD also are provided Purchasing considerations It s not surprising that all scopes do a good job of acquiring and displaying waveforms given the maturity of the oscilloscope market But many scopes offer greater value by also including extensive trigger measurement and analysis capabilities However fun damental trade offs exist that govern the mix of features within any one model For example high bandwidth direct sampling scopes are expensive If you have a small budget but need high bandwidth you might consider renting a suitable scope Or you may be able to use a much lower cost scope with equivalent time sampling if your signals are repetitive The way in which a feature has been implemented may or may not be ap propriate for your application Some scopes feature a high waveform update rate but only for short acquisitions High resolution can be accomplished in many ways each with significant implications And not all options are compatible with all scopes from a par ticular manufacturer Sometimes it s a matter of speed There s little point in trying to use 10G Ethernet compliance software on a 100 MHz scope In other cases marketing decisions may restrict the availability of options for a particu lar scope Because so many variables influence the answer to what s wrong with this signal the best way to choose a scope is to evaluate it for a reasonable period of time with your own inputs E
36. West Coast The three day event carries the subtitle Sensing Technologies Driving Tomorrow s Solutions The market for sensors and related technologies is expand ing at a phenomenal rate the expo organizers report With the convergence of MEMS wireless wearables and the Internet of Things IoT the sales of sensors in the United States alone are expected to climb to nearly 15 billion in 2016 In 2014 Sensors Expo welcomed 5 000 attendees from 45 states and more than 40 countries Hot topics included the IoT M2M wireless energy harvesting and high performance com puting and communications HPCC This year the IoT wire less sensor networks and MEMS will be back with emphasis on measurement and detection optical sensing and detection sensor fusion sensors at work smart cities and wearables Sensors Expo will feature more than 65 conference sessions in tracks including embedded systems energy harvesting IoT MEMS measurement and detection optical sensing sensors at work wearables and wireless Key presentations include Energy Harvesting with ZigBee and NFC by Roman Budek product marketing Smart Home and Energy NXP Semiconductors Enabling Technologies for the Internet of Things by Jean Philippe Polizzi micro and nanosystems program manager CEA Leti Minimize Motion Design Using Production Ready Building Blocks by Jeannette Wilson product marketing manager Microchip Technology Designin
37. aces for LEDs and varistors The basic price for the new 50 V two chan nel Model GS820 is 9 490 Yokogawa Corp of America www rsleads com 506ee 207 EE LITERATURE MARKETPLACE PRODUCT SAFETY TEST EQUIPMENT ED amp D a world leader in Product Safety Test Equipment manufac a turing offers a full line of equip ment for meeting various UL IEC CSA CE ASTM MIL and other standards Product line covers cat egories such as hipot leakage cur rent ground force impact burn temperature access ingress IP code cord flex voltage power plastics and others ED amp D Visit www rsleads com 506ee 360 NEW AMPLIFIER FUNDAMENTALS POSTER BY AR AANO Request your free copy of AR s New Amplifier Fundamentals Poster This reference poster in cludes all the basics you need to know about linearity gain VSWR modulation and more Download an electronic version from our website or request a hard copy www bit ly amplifierfundamen tals AR RF Microwave en a Visit www rsleads com 506ee 361 IP CODE amp NEMATESTING CertifiGroup offers a full UL CSA IEC and CE ISO 17025 Accredited International Product Test amp Cer tification Laboratory The lab includes a unique indoor wet lab where CertifiGroup specializes in IP Code amp NEMA testing for prod ucts subject to dust water ingress and similar hazards The Certi fiGroup indoor IP Code Wet Lab is one of the world s largest and most
38. ampling frequency often is many octaves above the passband Anti image filter reconstruction filter Digital audio signals can only represent a selected bandwidth When constructing an analog signal from a digital audio data stream a direct conversion of sample data values to analog voltages will produce images of the audio band spectrum at multiples of the sampling frequency Normally these images are removed by an anti imaging filter This filter has a stopband that starts at half of the sampling frequency the folding frequency Modern audio DACs usually have this anti imaging filter June 2015 evaluationengineering com 23 INSTRUMENTATION 10 20 30 40 50 60 70 80 90 100 110 120 1340 140 150 160 170 L ra dErA 2k odk k Sk 10k 123k 1k lk 18k 20k Frequency Hz Figure 7 Jitter sidebands of 10 kHz DAC B Level dErA 8 k k 6k Ble 10k 12k 14k 16k 18k Frequency Hz Figure 8 Jitter sidebands of 10 kHz DAC C THD N Ratio dB 140 20 30 30 100 200 300 Figure 9 DAC B THD N during jitter tolerance sweep 24 evaluationengineering com June 2015 20k 300 22k 24k 26k 22k 3k 26k lk Frequency Hz Wk 28k 30k 30k 32k implemented with a combination of two filters a sharp cutoff digital finite impulse response FIR filter followed by a relatively simple low order analog filter The digital filter is operating on an oversampled
39. ance For example in this simple illustration of measuring a single tone 600 MHz sine wave signal and wanting to see the basic AA KEvsiGHT infini Vision MSO X 31047 mives signal Osdticcape 1GHr Gals mesa Zoom Figure 1 Time domain capture at 1 ns div and FFT display from a 600 MHz sine wave input June 2015 spectral characteristics of that signal the oscilloscope has to have enough analog bandwidth to minimally attenuate the am plitude of the signal Since this oscilloscope has a maximum 1 GHz analog bandwidth there is plenty of oscilloscope band width to measure the 600 MHz tone To avoid aliasing in the digitizing process sampling must occur at a rate at least twice the frequency of any appreciable frequencies present in the signal under test In this exam ple a 1 2 GHz sampling rate would be required Clearly if the scope is sampling at its maximum 5 GS s rate that is more than sufficient However it will be shown later that for certain scope time base settings the sample rate and band width will decrease So what kind of quality is there in the FFT measurement made on the 600 MHz sine wave Referring back to the oscil loscope FFT measurement in Figure 1 notice the main single frequency spike with a related measurement marker showing around a 600 MHz frequency and 0 dBm power That matches expectations but the FFT response looks very wide for a single frequency input signal The spacing between frequency spect
40. ansport equipment for Optical Transport Network OTN applications For field optical test Anritsu presented the MT1000A Net work Master Pro which supports OTN MPLS TP and Ethernet as well as Fibre Channel SDH SONET and PDH DSn 50 GHz electro absorption modulator In other news at OFC nanoelectronics research center imec its associated lab at Ghent University Intec and Stanford Uni versity demonstrated a compact germanium Ge waveguide electro absorption modulator EAM with a modulation band width beyond 50 GHz Combining state of the art extinction ratio and low insertion loss with an ultra low capacitance of just 10 fF the demonstrated EAM marks an important mile stone for the realization of next generation silicon integrated optical interconnects at 50 Gb s and beyond Future chip level optical interconnects require integrated op tical modulators with stringent requirements for modulation efficiency and bandwidth as well as for footprint and thermal robustness In the presented work imec and its partners have improved the state of the art for Ge EAMs on Si realizing high er modulation speed higher modulation efficiency and lower capacitance This performance was obtained by fully leverag ing the strong confinement of the optical and electrical fields in the Ge waveguides as enabled in imec s 200 mm Silicon Photonics platform The EAM was implemented along with various Si waveguide devices highly efficient grating co
41. art at 75 600 SDA 8 Zi B U S list prices begin at 90 600 Delivery time is approximately six to eight weeks ARO 0 E calibration module for VNAs Anritsu introduced the MN4765B O E Calibration Module Figure 3 for its MS4640B Series VectorStar vector network analyzers VNAs creating a cost effective and flexible solution for measuring 40 Gb s components and transceivers Serving as an optical receiver the MN4765B allows engineers to use the MS4640B Series to perform accurate and stable optoelectronic measurements on laser modulators and photo receivers during R amp D and manufacturing The MN4765B also can be used with the VNA to characterize optical transmitters receivers and transceivers Magnitude and phase characterization is obtained using a primary standard characterized by NIST and conducted in the Anritsu calibration lab The result is improved measurement uncertainty when the MN4765B is used with VectorStar across the VNA s 70 kHz to 70 GHz frequency range The MS4640B Series VectorStar VNAs when calibrated using the MN4765B module enable error corrected transfer function group delay and return loss measurements of E O and O E components and subsystems The MN4765B module is thermally stabilized to elimi nate drift in photo diode performance over temperature and designed with additional circuitry for temperature and bias stability The InGaAs photodiode has a bandwidth response to 70 GHz and a typical re spo
42. ased activity in in ternational markets ETS Lindgren has eight factories worldwide Almost all of them have some shielding capability because that s the largest volume prod uct The absorber is made in Oklahoma Sayler continued We do our own re search and development and have quite a capable team for dealing with not only the chemical properties of the foam but also the mathematical modeling of the shapes In addition to local factories the com pany has established several overseas subsidiaries Sayler explained In Chi na we have a wholly owned foreign en tity ETS Lindgren China In India we have the same In Tokyo we have a legal entity ETS Lindgren Japan In Singapore and Taiwan we have offices that are part of our U S business Based on market size sometimes we ll work through a distributor and sometimes we ll work direct Beyond shielding and absorbers ETS also manufactures antennas field probes line impedance stabilization net works GTEMs reverberation chambers and full anechoic chambers Of course few companies including ETS actually make all the parts of a complex test sys tem Sayler discussed the advantages of working with a number of well estab lished companies to provide the best solution for each customer He said We have a number of partners that we work with such as Rohde amp Schwarz Key sight Technologies and Anritsu major instrument suppliers If they have equip
43. constant across the jitter sweep indicating good jitter tolerance in this DUT As the jitter level rises poor tolerance will cause a receiver to de code the signal incorrectly and then fail to decode the signal occasionally muting or sometimes losing lock altogether Figure 10 shows the response of the anti alias filter in ADC C A tone at the input of the ADC is swept across the out of band OOB range of interest in this case from 40 kHz to 200 kHz and the level of the signal reflected into the passband is plotted against the stimulus frequency A second trace shows the converter noise floor as a reference For Figure 11 spectrally flat random noise is presented to the DAC input The analog output is plotted with many aver ages to show the response of the DAC s anti image filter In this case a second trace showing a 1 kHz tone and the DAC noise floor is plotted scaled so that the sine peak corresponds to the noise peak Polarity Audio circuits including converters often use differential balanced architectures This opens the door for polarity faults An impulse response stimulus provides a clear ob servation of normal or reversed polarity Figure 12 Summary Tests for the high level nonlinear behavior of an ADC are similar to those for nonlinearities in analog electronics using standardized tests for harmonic distortion and in termodulation distortion But audio converters bring new mechanisms for nonlinearity par
44. ct Sales Offices in USA UK Sweden Germany Czech Republic France and China Visit www rsleads com 506ee 008 PAM 4 insights don t schedule meetings J Keysight Advanced Design System They come when they re Foi li good and ready for Ethernet PAM 4 and NRZ compliance with the Ethernet Compliance Test Bench also available EEFEP l Some call them Eureka moments Others call them epiphanies We call F bs airs them insights the precise moments when you know you ve found great ae answers As the networking Industry considers transitioning to more complex signaling we can help you achieve insights to meet the technical challenges of PAM 4 that lie ahead From simulating new designs to characterizing inputs outputs and connectors we have the software hardware and measurement expertise you need to succeed DHA Ri A ee EP RRS Keysight Infiniium Z Series oscilloscopes Compliance solutions available for current and HARDWARE SOFTWARE PEOPLE PAM 4 INSIGHTS PEOPLE Member representatives in test working groups including IEEE OIF CEI and Fibre Channel Industry Association Applications engineers in more than 100 countries around the world Nearly 7 000 patents granted or pending Implications on pe M9 S and the Download our app note PAM 4 Design Challenges and the Implications on Test at www keysight com find PAM 4 insight 0 vu USA 800 829 4444 CAN 877 894 4414 5 Keysight Technol
45. development time and provides a single apply to our test equipment too Unlike traditional instruments with predefined functionality the NI automated test platform provides the latest technologies to environment that simplifies ma hardware integration and build complex systems while reducing development time and cost oe reduces execution time gt gt Accelerate your productivity at ni com automated test platform 800 891 8841 gt Cf NATIONAL p INSTRUMENTS Visit www rsleads com 506ee 007 EDITORIAL Moore s Law and electronic heirlooms ple Watch Clearly the advances in semiconductor technology forecast by Gordon Moore enable Apple to pack so much functionality into a package so small But Moore s Law and a possible deceleration in semiconductor scaling may have unusual ramifications for consumer electronics devices in general and products like the Apple Watch in particular Consider that with the Apple Watch Apple for the first time is getting into the luxury fashion business Previously an entry level employee s iPhone would be identical to the CEO s That s no longer the case as Will Oremus in Slate has point ed out Now the employee can buy an Apple Watch for a few hundred dollars while the CEO can spend 10 000 and up That brings up the question who is going to spend upwards of 10 000 for a watch that will be obsolete in a couple of years The gold case may retain its value but the silicon inside
46. e for identifying segregating and analyzing different types of GSM mobile calls over TDM and IP transport networks GL s network monitoring and diagnostic system can provide key performance indicators failure analysis and call trace capabil ity and more Vadalia said GL provides a variety of solutions for net work wide monitoring and surveillance The solution consists of intrusive and nonintrusive PC probes for TDM VoIP and wireless networks Probes deployed at strategic locations in a network transmit and collect voice data protocol statistics and performance information and relay this information to a central distributed network management system NMS called NetSurveyorWeb He added GL s network monitoring and diagnostic system can be used for billing verification remote protocol analysis and traffic engineering It also can provide key per formance indicators failure analysis and call trace capabil ity A service provider or an equipment manufacturer must Base Station Subsystem B55 i ih i BTS o 7 A GSM R Radio Devices GSM Mobile Devices Figure 2 Enhanced GSM protocol test suite Courtesy of GL Communications SPECIAL REPORT REMOTE MONITORING im have the means to perform the aforementioned surveillance tasks cost effectively remotely automatically and nonintru sively Fortunately the network backbone contains a wealth of information that can be monitored and collected t
47. e replaced The eBIRST tools achieve this task by measuring the path resistance between different pins on the switching system connector and controlling the path through the system to allow it to test any of the relays in the system Systems that use separate input and output connec tions can be tested by use of two eBIRST tools in a master slave configuration The application program which is free to download from the Pickering Interfaces website is regularly updated to in clude support for a growing range of Pickering Interfaces switching products Pickering Interfaces www rsleads com 506ee 201 Immunity Test System The NSG 4060 complies with current testing standards including EN 61326 3 1 IEC 61850 3 IEC 60255 22 7 IEC 60533 IEC 60945 IEC 61000 4 16 and IEC 61000 4 19 and meets the new requirements for immunity testing to low frequency disturbances in the frequency range of 15 Hz to 150 kHz Suitable for use by manufacturers of smart electrical me ters industrial circuit breakers and industrial Ethernet and shipboard equipment the NSG 4060 is a robust system with an intuitive front panel that enables the unit to run fully com pliant tests without a PC It accurately tests low frequency immunity in common and differential mode The NSG 4060 shares the same chassis and user inter face as the NSG 4070 RF conducted immunity system featuring a 5 7 inch color display and hard keys for impor tant functions A user manual
48. eform to auto matically create the upper and lower lim its of a test mask The mask testing in some Keysight and R amp S models is hard ware accelerated speeding up manufac turing and statistical analysis In general mask testing occurs after an acquisition has been completed Wave form match triggering also performs limit testing but on the fly before acqui sition The user defined FPGA in NI s software designed scopes allows the user to create a custom trigger solution As the company s Gindorf explained a specific example is a trigger that continuously monitors the signal ac quired by an oscilloscope and is able to detect a specific signal shape without any dead time The unique nature of the June 2015 Sponsored by ROHDE amp SCHWARZ waveform match trigger is the capabil ity to customize trigger limits in hard ware where other solutions can only provide this level of customization in a software trigger solution This is useful for acquiring very infrequent glitches in a signal that otherwise would demand a very long acquisition and measurement time Measurements have been available on DSOs for many years but they have proliferated and some unusual ones have appeared For example Oltman said that more than 30 general purpose time domain measurements are built into the company s ZT Series scopes In addition and much less common a number of frequency domain measure ments such as SFDR THD
49. em and allows our customers to begin virtualiz ing parts of their network while maintaining visibility across the network to ensure a holistic customer experience She emphasized some key features of TestCenter Live 8500 including ease of use and flexibility The virtual probe is fully integrated into the existing Spirent TestCenter Live solution so there is no new learning curve for the technicians using the sys tem she said In addition CSPs can monitor their entire net work both physical and virtual assets with one system And finally she said The 8500 is easy to instantiate when needed so CSPs have the added benefit of turning up service assurance at Virtual probes increase efficiency by increasing the limit of probe testing Virtual probes increase agility by offering test results and analysis quickly Virtual probes cost less to use because no field technician is needed Virtual probes use the same technology found in the datacenter PROBE Backhaul payaa lt VIRTUAT PROBE Enterprise J D i e Where HW probes can be used A where virtual probes can be used L IM Figure 1 TestCenter Live 8500 virtual probe deployment Courtesy of Spirent Communications June 2015 the same time new services are activated This flexibility means CSPs can offer the best possible experience to their subscribers Voice and data test GL Communications offers voice and data test solutions for T1 E1 T3
50. ement system for single sweep po larization testing In addition Loeffler said Superior tuning repeatability and linearity reduce the uncertainty of all wave length dependent tests thereby reducing guardbands and increasing manufacturing yield Loeffler said the company s tunable laser expertise goes back to the step tunable HP 8161A in 1992 In fact he said Since the HP 8153A lightwave multimeter our first two slot mainframe introduced in 1990 we have furnished component manufactur ers researchers and developers working in photonics and fiber optics with an ever growing modular test equipment portfolio complemented by signal generation and analysis test gear for the terabit era Compared with the current 81600B laser which Loeffler called the industry standard for more than a decade the 81606A tunable laser offers these features 15 dB more dynamic range through higher signal power with lower spontaneous emission enabled by the new cavity and la ser module design June 2015 e fourfold improvement in absolute accuracy with increased real time tracking speed and resolution enabled by the novel wave length reference unit and e 40 times faster sweeps without impacting the specified dynam ic accuracy enabled by enhanced feedback controls and drive mechanics When component developers validate their designs they want to get maximum confidence from their measurements in virtually no time said Dr
51. erPro Ill an open architecture software platform the C8000 platform provides users a flexible expandable and cost effective test system for engineering R amp D design validation and verification production testing quality assurance and incoming inspection LED Bulb Tube ATE Instruments Chroma manufactures best in class programmable COTS instrumentation including AC Power Sources DC Supplies Electronic Loads Digital Power Meters and Electrical Safety Testers that are ideal for power input output terminal testing and dynamic simulation PowerPro Ill An enterprise wide open architecture software platform Users benefit from its custom reporting with waveforms and graphs fast and easy test sequence development and it s built in comprehensive test library Automated systems are designed racked wired and tested in Orange County California Visit www rsleads com 506ee 004 chromausa com 949 600 6400 sales chromausa com MEASUREMENT COMPUTING Great 16 Bit DAQ Solutions Easy to Use e Easy to Integrate Easy to Support Ethernet Multifunction E 1608 Only 499 8 SE 4 Diff analog inputs 250 kS s sampling 2 analog outputs 8 digital I O 1 counter Low Cost Multifunction USB 231 Only 249 8 SE 4 Diff analog inputs 50 kS s sampling 2 analog outputs 8 digital I O e 1 counter High Speed Multifunction USB 1608GX 2AO Only 799 16 SE 8 Diff analog inputs 500 kS s sampling 2 analog outputs 8 digital I
52. erse of frequency below 8 kHz to level off at 10 UI peak to peak below 200 Hz In this case jitter is set to about 9 775 UI at the lower jitter frequencies and drops to about 0 25 UI at the higher frequen RENT Test Gear www atecorp com CALL TODAY AC amp DC Loads EMC Test Systems Environmental Chambers High Power RF Amplifiers High Output AC DC Power Supplies and more GET THE ATEC ASSURANCE ASQ Certified Technicians Expert Technical Support Calibrated Equipment Same Day Local Delivery Satisfaction Guaranteed ORDER NOW 800 404 2832 Established 1981 Advanced Test Equipment Rentals The Knowledge The Equipment The Solution Visit www rsleads com 506ee 002 INSTRUMENTATION Interpretation of noise in FFT power spectra In audio systems noise figures generally are measured and reported something like this 103 dB rms noise 20 Hz to 20 kHz BW A weighted The noise signal is measured with an rms detector across a specified bandwidth The 0 dB reference for the noise mea surement might be the nominal operating level of a device but more typically is the maximum operating level which produces a more impressive number Similarly weighting filters usually produce better noise figures and so often are used in marketing specifications A weighting filter attempts to approximate the response that we humans perceive So let s measure the noise of DAC B using these methods We ll make an rms measurement
53. facturers de fense contractors and DoD government education and in dividual end users Teledyne LeCroy will work with Saelig to assist engineers and procurement professionals in choosing the best instrument for the tough product development chal lenges they face Anritsu and EMITE tout repeatable LTE lab tests Anritsu and EMITE announced that the Anritsu MT8820C ra dio communication tester has been successfully used in com bination with the EMITE E500 reverberation chamber and an Anite Propsim FS8 channel emulator to test LTE carrier aggre gation using 2x2 MIMO and more realistic isotropic Urban Macro UMA fading profiles The tests were performed for a leading U S carrier We are very happy to have Anritsu s excellent MT8820C base station emulators integrated in our MIMO OTA Carrier Aggregation RC CE test platform as this will certainly add value to our customers said David Sanchez Hernandez CEO and cofounder of EMITE Being able to test LTE CA MIMO UMA with a variety of auxiliary equipment units is a novelty worldwide and brings MIMO OTA testing to a higher level of realism and applicability worldwide Altera joins Industrial Internet Consortium Altera announced the company has joined the Industrial In ternet Consortium a collaborative industry organization fa cilitating development of a global ecosystem for the Internet of Things Specifically Altera is working together with the con sortium s
54. for semiconductor manufacturing Emerging memory technology update on MRAM ReRAM and 3DNAND What s next for MEMS Flexible hybrid electronics for wearable applications Current challenges and future opportunities for the semiconductor supply chain Sustainable manufacturing Wafer Processing Front end Interconnect technology for high performance computing Materials and contamination control in the sub 20 nm era Role of subsystems and components at future technology nodes Lithography cost and productivity issues below 14 nm Transistor scaling solutions for high volume manufacturing The role of secondary equipment in loT CMP technical and market trends pssomnyy and Test Back end The future of semiconductor packaging technology Packaging of digital health devices Packaging of devices for automotive applications Automating semiconductor test productivity Test Vision 2020 The Road to the Future of Test Use SEMICONWest and join the conversation on Twitter and Facebook Visit www rsleads com 506ee 009 32 evaluationengineering com Convergence drives sensor proliferation By Rick Nelson Executive Editor cusing exclusively on sensors and sensor integrated sys tems when it convenes June 9 11 in Long Beach CA the expo s first time at that location Organizers say the venue will offer attendees easy access from Silicon Valley and cutting edge aerospace and defense medical entertainment and other mar kets on the
55. g it s digital Apart from rare sightings of vinyl or open reel tape in boutique sales or creative enclaves audio is digital Done right digital au dio is flexible robust and of very high quality Pulse code modulation PCM recording lossless surround formats and even lossy compression at least at high data rates provide the soundtrack for our lives But of course sound in air is not digi tal The pressure waves created by a hu man voice or a musical instrument are recorded after exciting a transducer of some sort and the transducer responds with an electrical voltage that is an ana log of the pressure wave Likewise at the end of the chain the digitized audio signal must eventually move air using a voltage that is the analog of the original sound wave to drive a transducer that creates a pressure wave Near the beginning of a digital chain then we must use an analog to digital converter ADC to transform the analog electrical signal to a digital representation of that signal Near the end of the chain we must use a digital to analog converter DAC to transform the digital audio sig nal back into an analog electrical signal Along with the transducers these two links in the chain the ADC and the DAC are key in determining the overall quality of the sound presented to the listener 2015 there s not much question Testing audio converters The conventional measurements used in audio test also can be
56. g Smart Medical Devices with Force Sensing Technol ogy by Mark Lowe vice president of sensor business Tekscan Ultra Low Power Sensor Sampling Solutions for Energy Har vesting Applications by Mark Buccini director Texas Instru ments Using Real Time Ethernet to Optimize Mechatronic Systems Performance by Sari Germanos technology market ing manager Ethernet POWERLINK Standardization Group and Overcoming the Challenges of Testing in Harsh Aero space and Industrial Environments by Randy Martin director Meggitt Sensing Systems Ges Expo amp Conference will celebrate 30 years of fo Sensor products on exhibit As this article went to press more than 200 companies were scheduled to exhibit at the 2015 event The following have made news recently hinting at what they might highlight at the show e Anaren launched its Cellular Machines line which sends real time sensor data over a cellular network where it can be received on mobile devices or reviewed on desktops via a cloud server e Coto Technology at MD amp M West 2015 released its RedRock RR100 MEMS based magnetic reed sensor which has a num ber of medical device applications including portable insulin pumps capsule endoscopes hearing aids insulin pens medical wearables and other small battery powered medical devices e Omega Engineering recently debuted its UWBT Series Blue tooth transmitter which measures sensor inputs such as thermo couple RTD
57. ghts Now we re raising the standard again with two new Keysight Truevolt DMMs the 6 digit 34465A and 7 digit 34470A Both models build on Truevolt s graphical capabilities such as trend and histogram charts offering more insights quickly They provide a data logging mode for easier trend analysis and a digitizing mode for capturing transients Also both offer auto calibration that allows you to maintain measurement accuracy throughout your workday Our new 7 digit DMM offers greater resolution and accuracy for your most challenging devices bim TE A co a e LPL l Truevolt DMMs 34461A 34465A NEW 34470A NEW e WPCC Tine OH On hid Bere Ot Or Randiegs Resolution 6 digits 6 digits 7 digits tare DCV accuracy 35 ppm 30 ppm 16 ppm Linearity 2 ppm 1 ppm 0 5 ppm Reading speed 1k s 5 k s opt 50 k s 5 k s opt 50 k s BenchVue software enabled Control your DMM with other Keysight instruments via a PC or mobile device KEYSIGHT View DMM test challenge application briefs and videos TECHNOLOGIES TESTEQUITY wwwetestequity com Keysight_DMM Buy from an Authorized Distributor 800 732 3457 Unlocking Measurement Insights Keysight Technologies Inc 2015 Value in USD See website for full details Agilent s Electronic Measurement Group is now Keysight Technologies INSTRUMENTATION Testing audio ADCs and DACs By David Mathew Audio Precision about audio storage transmission or streamin
58. ging the way they approach service assurance and service experience To assist these customers Spirent offers the TestCenter Live 8500 Figure 1 which Emery described as the first virtualized service assurance probe in the industry Although the primary customers for Spirent s products and services are the CSPs NEBS compliance is not an issue because the server is already in the datacenter Emery added our goal is to help our customers improve the experience of their subscribers so our focus is on holistic customer experience Emery said that proactive network management can offer CSPs a competitive advantage but being proactive requires fo cus and investment Fortunately she said technologies like virtualization and our solution in particular are evolving to deliver and support more complex services requiring greater amounts of bandwidth When asked about key challenges customers are facing Em ery said All of our customers are currently considering virtu alization One of the key challenges facing CSPs moving toward NEV network functions virtualization and SDN software de fined networking is how to continue offering a superior cus tomer experience while the network is in transition Our virtual probe supports service assurance for virtualized network ele ments but uses a consistent interface with our traditional hard ware solution It is fully integrated into our OSS Operations Support Syst
59. growth rate the Sensors Conference offers an ideal opportunity to educate and inspire the engineering community on the critical technologies that will transform not only key business processes but how we live our lives today I am thrilled to be part of the event that high lights the increasingly innovative role of sensors and connects this community to inspire real change North holds several degrees in science and engineering including a Ph D in nanotechnology and his work has been published in many peer reviewed journals including Nature He has founded and cofounded several organizations includ ing Galapagos North Design Labs Nukotoys and ReAllocate The second keynoter will be Gadi Amit the designer behind projects such as Google Project Ara Fitbit fitness trackers and the Lytro camera In a 9 a m session on Thursday June 11 titled Why the Sensor Explosion Needs Technology Design he will comment on wearables the IoT home automation and mobile and cloud computing and he will explain how to make wear ables work and the key role of emotional intelligence as well as rational thinking The surge of innovative sensing technologies coming out marks an ongoing paradigm shift that s changing how we ll live and interact with our environments Amit said The Sen sors Conference offers a deeper look at the breadth of solutions available helping us dive into not just how but why design and engineer
60. hat might not always be the case That s an interesting perspective But I think Moore s Law has a ways to go The semiconductor analyst David Kanter offers an interesting post in his real world tech nologies blog that describes how innovations such as strained silicon high k gate dielectrics HfO and metal gate electrodes double patterning and FinFETs have brought us from 90 nm to where we are today with Intel pursuing the 10 nm node Going forward he predicts the industry will adopt quantum well FETs QWFETs with Intel leading the way at 10 nm and others following at 7 nm And if the 5 nm node achieved in a decade or two represents a limit on planar scaling we can increasingly adopt 3 D stacking So I think it s unlikely that anyone will be buying an heirloom laptop or smart watch any time soon Apple and other manufacturers would probably prefer it that way as an heir loom passed on represents the loss of a sale Meanwhile it remains to be seen if companies can develop a customer base that s willing to spend upwards of 10 000 every couple of years in pursuit of fashion and state of the art technology Visit my blog at the address below for links to the articles mentioned in this editorial JCA Veber Rick NELSON N pril marked the 50 anniversary of Moore s Law and the arrival of the Ap Executive Editor Visit my blog www evaluationengineering com ricks blog 4 evaluationengineering com June 2015
61. ify these tones Ae 160 170 0 2k 4k 6k 8k 10k 12k 14k 18k 20k 22k 24k 26k 28k 30k 32k Frequency Hz Figure 3 FFT idle channel noise DACA 22 evaluationengineering com June 2015 0 2k 4k 6k 8k 10k 12k 14k INSTRUMENTATION 16k 18k 20k 22k 24k 26k 28k 30k 32k Frequency Hz Figure 4 FFT idle channel noise DAC B Chl m 120 937 dB a 20 40 DynemicRange ds 00 120 140 Figure 5 SNR for DAC B The DAC in Figure 3 shows a number of idle tones some with levels as high as 130 dB The idle tones and the noise floor in Figure 4 are much lower Signal to noise ratio Dynamic range For analog audio devices an SNR measurement involves find ing the device maximum output and the bandwidth limited rms noise floor and reporting the difference between the two in decibels With audio converters the maximum level usually is defined as that level where the peaks of a sine wave just touch the maxi mum and minimum sample values This is called full scale 1 FS which can be expressed logarithmically as 0 dBFS The rms noise floor is a little tricky to measure because of low level idle tones and in some converters muting that is applied when the signal input is zero AES17 recommends that a 60 dB tone be applied to defeat any muting and to allow the converter to operate linearly The distortion products of this tone are so low they fall below the noise floor and the tone itself is notched ou
62. ines a Pe ete r L a 2 7 Pa i PERRA cree eee Pe Boe r Them E ggtalelieatteliegteetsertesters estentesttes f i De a ope Spe r a a 1 1 T rs FP a et ee ee J ay fay eye Fe Fe ed es a HE PP el Ce er n T ih Cr apie t PEHARA HNE Parengta t i Hot APP eat ee eat eee be anne ee j os 3 a G F P e el el s i feppteg taste tag tee t i HoR P teeta te f z balt e F tte Ad r SaF Fi 2 et t i P a tpp Pp F Sip F nr Th iE Wnt i T REHE i a Wa J j Ba Fr i am as Oe Oe te A E Sie 2 mm li Oe BU MELD ME ME 5 J Te ia 5 a P h omm Se me peme mem TETE TEE CAOL FEL ATOL IOL EL le igen C i ora m e m n E BF oe F i a Tie i j 4 F 1 wy teu i se E i we H H is i A r j zz H F p T i aes i es p F a gE gt I The Next Generation in Semiconductor Test has Arrived e Timing per pin architecture with 1ns edge placement and 64 time sets offers uncompromised digital test capability e Industry leading GX5296 digital subsystem offers 32 channels per module with PMU per pin e Full featured sequencer with 64 Mb per pin ideal for device and SoC test Join us at SEMICON West 2015 MARVINTEST COM Booth 6363 2015 Marvin Test Solutions Inc All rights reserved Product and trade names are property of their respective companies Visit www rsleads com 506ee 005
63. ing choices should be made I look forward to con necting with my colleagues and advancing the conversation as we discuss what helps make a truly impactful experience for wearables IoT and cloud computing EE Reference 1 Lecklider T Sensors support tomorrow s technical advances EE Evaluation Engineering August 2014 p 8 Register Today at www sensorsexpo com with code EE50 for special discount and take advantage of the lowest rate for 2015 Sees e555m eee es Sete ai a Sih 6S TLO ELLI TTC a m r chee FE F 7 i j E a 4 sR Evik June 9 11 2015 Long Beach Convention Center e California n Sensors Sea ie EJ conterence a 5a a wi ad Interested in becoming an exhibitor or sponsoring this year s event email us at cgrotonfaquestex com Visit www rsleads com 506ee 011 MEDICAL TEST Strict EMIC rules aim for secure healthcare environment By Bruce Fagley TUV Rheinland IEC 60601 1 2 certainly takes that to heart The updated standard introduces many technical changes for electro magnetic compatibility EMC requirements for medical de vices with an eye toward ensuring that EMC phenomena do not interrupt or jeopardize safe healthcare delivery in today s technologically complex environment The new standard comes into force in April 2017 in
64. itecture by allowing customized algorithms to be imple mented in the trigger circuitry Keysight Technologies Daniel Bogdanoff product man ager was in no doubt when he replied The most important Figure 1 Eye diagram generated by DPOJET software displayed via Tekscope Anywhere Courtesy of Tektronix June 2015 feature for top down faultfinding and debugging is waveform update rate The higher the waveform update rate of an oscil loscope the higher the likelihood of seeing a glitch or error in the waveform Several Keysight datasheets quote 1 000 000 waveforms s update rate Bogdanoff also mentioned the com pany s Zone touch trigger that allows users to graphically de fine a complex trigger condition on screen Richard Markley oscilloscope product manager at Rohde amp Schwarz America agreed that waveform update speed was critical explaining that many times not knowing there is an issue is a customer s biggest fear The less time the scope is working on processing and the more time it is seeing the signal the more likely you are to find infrequent events The compa ny s RTO series DSOs achieve 1 000 000 waveforms s update rate for the analog input channels UltraVision technology which involves both a special chipset and associated software is key to achieving up to 180 000 waveforms s update rate in Rigol Technologies scopes with bandwidths from 50 MHz to 1 GHz Chris Armstrong directo
65. ize fits all approach exists Our experience and years of learning from our existing probing business tell us that this is a fallacy as no two operators needs are ever the same and the require ments of tomorrow will be substantially different from what they are today He added This announcement demonstrates our understanding of the new market requirements of virtual ized networks We understand that network infrastructure is changing and growing Figure 3 T1 E1 Express PCle analysis and emulation boards Courtesy of GL Communications Railway Traffic Management System 2 a mw CAP INAP m ri Y ta gsmSSF June 2015 evaluationengineering com 19 BEST SCOPES BEST PRICES USB SCOPE ADAPTER 129 Great scopes for field use with laptops Up to 200MHz bandwidth with 1GSa s high speed data streaming to 1MSa s built in 1GSa s arbitrary waveform generator and function generator PS2200A series Pitiiees ai MBGGeeGy 50MHz SCOPE 399 50MHz 4 ch scope at 2 ch price Up to 1GSa s rate and huge 12Mpts memory Innovative UltraVision technology for real time waveform recording FREE carry 100MHz SCOPE 429 Amazing 00MHz 2 ch scope with 1GSa s real time sample rate and huge amount of memory 8 inch color TFT LCD screen with 800x600 resolution FREE cary case included SDS7 02V Col ee 70 300MHzSCOPES 839 Fast versatile 2 ch 2GSa s scope
66. n nelsonpub com W VERIFIED NP Communications urges readers to please pass on or recycle this magazine NP COMMUNICATIONS LLC 2477 Stickney Point Rd Suite 221B Sarasota Florida 34231 Phone 941 388 7050 Fax 941 388 7490 Publishers of this magazine assume no responsibility for statements made by their advertisers in business competition nor do they assume responsibility for statements opinions expressed or implied in the columns of this magazine Printed in the U S A Switching for Every Application Because in Electronic Test One Platform Does Not Fit All ae EH 3 n T s g WW f a g V2PPTeaer Se ne iD ae Ee a a p _ Now supported by DIRO I Pickering Interfaces Switching Advantages in PXI LXI and PCI ranging from low level DC to 1000 V RF Microwave to 65 GHz including eBIRST Switching System Test Tools quickly and accurately locate switching system faults Visit pickeringtest com ebirst or scan matic QR code to learn more about eBIRST er 3 Year ORO ueucuSE We stand behind our products For more information scan this QR Code with a standard three year warranty or go to pickeringtest com advantage m Ft Switching Instrumentation Programmable Resistors Custom Design Cables amp Connectors a i pickeringtest com SON 541 471 0700 West Coast 781 897 1710 East Coast ussales pickeringtest com pickering L Dire
67. n the levels specified for the health care and home environments 34 evaluationengineering com June 2015 A closer look at EMC risks Section 4 1 and Annex F of the fourth edition require that manu facturers include EMC risks in the risk management file which the test laboratory now needs to review The laboratory s re sponsibility is to ensure the device maker adequately addressed all EMC risks without actually evaluating the file While the fourth edition requirements cover the usual EMC phenomena manufacturers are encouraged to consider other EMC risks specific to the environment of use in their risk analy sis That means the product may need to be tested to other EMC standards such as IEC 61000 4 16 and MIL STD 461 Additionally section 6 2 of the standard instructs the manu facturer to provide an EMC test plan to the laboratory Table G1 of section 6 2 explains what to include in it As with the risk management file the EMC lab does not evaluate the test plan but must follow it to the letter Manufacturers can refer to An nex G for guidance on writing a test plan which needs to be included in the test report In addition to the test plan and risk management file manu facturers must supply the test lab with a more in depth descrip tion of the device s essential performance specify detailed product specific performance criteria for use during the immu nity testing write a specific plan allowing for monitoring the
68. nge of answers Teledyne LeCroy s Chris Busso senior product marketing manager emphasized the in creased vertical resolution in the company s HDO high defini tion oscilloscopes With 16 times the resolution of typical 8 bit in struments these scopes should help users find small signal faults more easily LeCroy DSOs also feature the WaveScan search and analysis tool which you can program to look for up to 20 criteria such as rise time nonmonotonic edges and runts in waveforms Triggering was at the top of a list of Tektronix scope capa bilities provided by Chris Loberg senior technical marketing manager at the company In addition he included the new asynchronous time interleaving technology available in the re cently launched DPO70000SX Series scopes with up to 70 GHz bandwidth And on the software side DPOJET is Tek s pack age that addresses jitter and timing issues to help determine the root cause DPOJET is key to the various communications standards testing Tek scopes can perform Figure 1 Triggering also was the topic addressed by National Instru ments Christian Gindorf senior product manager He dis cussed the open FPGA architecture used in the company s PXIe 5170 71R scopes which allows users to define their own custom triggers in hardware to help pinpoint elusive anomalies in the waveform The power of the FPGA is leveraged by giving the user complete access to the oscilloscopes triggering arch
69. nnual National Envi ronmental Education Week Created by NEFF and supported by Samsung the Schoolyard STEM Lab is an outdoor classroom space designed to work in any climate for a hands on immersive environmental education experience It consists of a Growing Dome greenhouse where students can apply the scientific method to cultivation projects 10 evaluationengineering com June 2015 The Growing Dome will not only help students better under stand STEM it also will help them make the significant connec tions between the natural environment and Navajo culture NREL purchases second AMETEK AC DC high power source AMETEK Programmable Power announced that the U S De partment of Energy s National Renewable Energy Laboratory NREL has placed an order for its second regenerative AC DC high power source When installed in parallel with the previous California In struments RS Series units purchased in 2013 the new system will have the capability to supply up to 2 MVA making it the largest system built by AMETEK Programmable Power Saelig announces distribution agreement with Teledyne LeCroy Saelig has been appointed an authorized distributor by Tele dyne LeCroy a manufacturer and supplier of oscilloscopes and serial data solutions The appointment will make Tele dyne LeCroy oscilloscopes arbitrary function generators and logic analyzers available to Saelig s customer base of electronic design engineers electronics manu
70. ns Oscilloscope and waveform images courtesy of Tektronix MEDICAL TEST Standards 34 Strict EMC rules aim for secure healthcare environment By Bruce Fagley EMC Technical Manager TUV Rheinland DEPARTMENTS 4 Editorial 10 EE Industry Update 38 EE Product Picks 39 Index of Advertisers Written by Engineers EVALUATION ENGINEERING for Engineers 12 18 22 28 32 SPECIAL REPORTS Oscilloscopes Increased insight through innovative technology By Tom Lecklider Senior Technical Editor Remote Monitoring Communications service providers look to test solutions By Rick Nelson Executive Editor Instrumentation Testing audio ADCs and DACs By David Mathew Audio Precision RF Microwave Test Scope FFT and waveform math functions take on RF measurements By Brad Frieden Keysight Technologies Sensors Convergence drives sensor proliferation By Rick Nelson Executive Editor COMMUNICATIONS TEST Optical Communications Test 36 Laser scope and calibration instruments debut at OFC By Rick Nelson Executive Editor EMCI EMI RFI Executive Insight 40 Managing EMC and wireless test By Tom Lecklider Senior Technical Editor evaluationengineering com EE EVALUATION ENGINEERING ISSN 0149 0370 Published monthly by NP Communications 2477 Stickney Point Rd Ste 221 B Sarasota FL 34231 Subscription rates 176 per year in the United States 193 60 per year in Canada Mexico International subscription
71. nsivity of 0 7 A W The MN4765B module complements the overall performance of the MS4640B VectorStar VNA which offers the 70 kHz to 70 GHz coverage and can extend coverage to 145 GHz in a broad band configuration The M54640B VNA also has a dynamic range of up to 142 dB Figure 3 MN4765B O E calibration module for the MS4640B Series VectorStar VNAs Courtesy of Anritsu OPTICAL COMMUNICATIONS TEST Anritsu also showcased technologies and test solutions for engineers who are designing emerging high speed transmis sion products and systems utilizing technologies from 400 Gb s to 1 Tb s for applications in the lab the production floor and the field For R amp D applications Anritsu highlighted its MP1800A BERT signal quality analyzer and MP1825B 4Tap Emphasis The test solutions will be configured as an ultra high speed transmission test system operating up to 1 Tb s with multi channel synchronization signals such as Quad DP 16QAM and Dual DP 64QAM Anritsu also featured a 400 G Su per Channel test solution that will combine the company s MZ1834A 4PAM Converter with the MP1800A to generate 4PAM signals For 400 Gb s Ethernet and 100 Gb s design and manufac turing environments Anritsu presented the Network Master Flex MT1100A This portable transport tester supports simul taneous installation of four independent 100 Gb s ports and it can send and receive a variety of 100 Gb s x 4 client signals to test 400 Gb s network and tr
72. o sup port these activities Other recently introduced products from GL include T1 E1 Express PCle analysis and emulation boards Figure 3 which can monitor T1 E1 line conditions such as frame errors viola tions alarms and clock or frame bit slips The boards sup port comprehensive analysis and emulation of voice data fax protocol analog and digital signals as well as echo and voice quality testing The boards are available with a GUI for Windows 7 and Windows 8 operating systems with support for almost all existing T1 E1 analyzer applications Software and modular hardware Tektronix Communications announced in April the addition of two new solutions GeoSoft and GeoBlade to its GeoProbe family GeoSoft is a software only or virtual probe that has been developed in response to a number of carrier needs in cluding the move toward virtualized network environments GeoBlade combines elastic software and modular hardware to cope with the demands of today s massive data traffic growth while pro viding the opportunity to scale at speed whenever needed GeoBlade has the capability to sup port data transfer speeds from 10 Gb s to hun dreds of Gb s collecting and correlating massive amounts of data in real time Commenting on the announcement in a press release Said Saadeh who leads the GeoProbe product team at Tektronix Communications stated There is a common misconception in the probing market that a one s
73. of this quality and this impact said Optical Society CEO Liz Rogan who also thanked cosponsors IEEE Communications Society and IEEE Photonics Society which is celebrating its 50 anni versary EE Evaluation Engineering was unable to attend the event but we did track down test equipment vendors to see what prod ucts and technologies they introduced at the show Qe marked its 40 anniversary when it convened re Tunable laser source Keysight Technologies highlighted its 81606A tunable laser source a new module for the 8164B lightwave measurement system Figure 1 Tunable lasers in combination with optical power meters and a polarization control ler can measure the filter slope isolation polarization depen dence insertion loss and reflectivity of multiplexers de multiplexers chan nel interleavers and wavelength selective switches used in re Figure 1 81606A tunable laser source in an 8164B mainframe Courtesy of Keysight Technologies configurable optical fiber networks According to Stefan Loeffler strategic product planner for the Keysight Digital and Photonic Test Division speaking in a phone interview before OFC the new product offers subpico meter tuning repeatability and best in class wavelength ac curacy to help validate more devices per hour and speed up automated adjustment of wavelength selective devices The company s N7700A software suite activates the laser and pow er meters within a measur
74. ogies Inc 2015 HARDWARE SOFTWARE Instruments designed for testing PAM 4 from simulation to compliance Advanced Design System software for simulation measurement correlation and workflow More than 4 000 electronic measurement tools Keysight M8195A 65 GSa s arbitrary waveform generator Flexible PAM 4 pattern generation for 400G Ethernet and beyond Keysight 86100D Infiniium DCA X wide bandwidth oscilloscope Compliance solutions for emerging optical and electrical PAM 4 Ethernet standards el ca atl el ol rT Ae EEE E eencroe cee Se te Keysight N5245A PNA X microwave network analyzer Keysight J BERT M8020A high performance BERT with N1930B physical layer test system software The most integrated solution for 100G Ethernet input testing Gigabit Ethernet interconnect and channel test solutions KEYSIGHT TECHNOLOGIES Unlocking Measurement Insights Your 5G Eureka moment will happen sooner or later We ll helo make it sooner The fifth generation of wireless communications may seem years away But if you want to be on the leading edge we ll help you gain a big head start We offer unparalleled expertise in wideband mmWave 5G waveforms and Massive MIMO We also offer the industry s most comprehensive portfolio of 5G solutions Whether you need advanced antenna and radio test hardware or early simulation software we ll help you with every stage of 5G PEOPLE HARDWARE SOFTWARE PEOPLE
75. omedical experiments because the wide dynamic range afforded by 4 096 digitizing levels allowed researchers to accommodate wave forms with unknown DC offsets yet still capture sufficient detail All Nicolet scopes used high res olution ADCs as do today s LeCroy HD4096 instruments to achieve the quoted resolution However many DSP based techniques have been de veloped to enhance the performance of the much lower cost and faster 8 bit ADCs commonly used in DSOs If a signal is repetitive averaging successive acquisitions works well to reduce noise One bit of resolution is added for every factor of four in the number of acquisitions x4 1 bit x16 2 bits For the majority of signals which are not repetitive averag ing acquisitions doesn t work Instead successive groups of points in sufficiently oversampled data may be averaged This approach does increase the resolution of a single acquisition but at the expense of both lower bandwidth and a lower output sampling rate As noted in a previous oscilloscope special report Rather than averaging successive blocks of samples averaging can be done over the first N points then over the N points from sam ple 2 to sample N 1 then from sample 3 to sample N 2 and so on This approach has two effects First it shortens the acquired data record by N points Second it maintains the original data rate This means that peaks appear where they should rather than possibly being offse
76. ommon wireless devices used within 30 cm The wireless proximity test is more severe than the old FDA wireless coexistence test e AC line immunity tests are performed at only one line voltage instead of two voltages specified in the third edition e A new requirement considers patient connected tubes filled with conductive liquid as cables and instructs they be tested for conducted immunity Manufacturers can refer to Table 7 for speci fications Medical device manufacturers should take note that the FDA does not accept the immunity testing exclusion for signal cables less than 3 meters long and requires cables be tested e Wireless communication devices must have the wireless func tion on during the immunity testing e The fourth edition includes a new Table 1 showing at what line voltage immunity tests must be performed Information technology in medical equipment According to section 4 2 of the fourth edition information tech nology equipment ITE that does not affect the basic safety or essential performance of the medical system can be evaluated to the ITE standards EN 55022 EN 55032 and EN 55024 which require testing above 1 GHz If ITE affects the basic safety and essential performance of the system then it must be tested to IEC 60601 1 2 which references CISPR 11 edition 5 1 and likely will not need to be tested above 1 GHz unless the system was classified as Group 2 Some equipment categories such as Group 2 and device
77. oves the window along the trace Whatever portion of the waveform is present in this window shows up in the lower trace but magnified An interesting measurement results from creating a small time width window at the very beginning of the pulse The FFT is calculated from the data contained within the gated time window as shown in Figure 5 The FFT measurement of the peak value amplitude and fre quency of the spike shows that the RF pulse begins with a carrier ee ee Do een B Figure 4 FFT of 4 us wide 20 us repeating linear FM chirp June 2015 evaluationengineering com 29 30 evaluationengineering com H RF MICROWAVE TEST MV KEYSIGHT infiniiVision MSO X 31047 nixed Signal OsdBostopa 16Hz basas MEGA oa i i 1 m l Whstuaeteatmat ia ti ET ive Pec A AEN sie re p a ELNAN EA Figure 5 Time gated FFT function observing the carrier at the beginning of the RF pulse frequency around 300 MHz If the time gate window is moved to the center of the RF pulse the frequency is seen to be around 600 MHz And it is 900 MHz at the end of the RF pulse This appears to be a linear frequency modulated chirp as desired Frequency measurement and measurement trend math function In some cases a measurement trend math function can give a helpful view of the frequency chirp profile The oscilloscope Always The Best Values In Small lt a Vibration Test Systems Y
78. pec trum you can integrate the power density over the frequency range of interest For an approximately flat total noise where the noise power density is roughly constant it is possible to estimate the sum of the power in each bin within reasonable accuracy by estimating the average noise power density and multiplying by the bandwidth Figure 4 for example has a noise floor that is approximate ly in line with about 163 dB on the Y axis The noise power density is the apparent noise floor minus the window conver sion factor or 163 dB 4 2 dB 167 2 dB per Hz The integration to figure the total noise over a given band width is simple if the noise is spectrally flat Multiply the noise power density by the bandwidth which in this case is 20 kHz For dB power dB 10logX this is the same as adding 43 dB 10log 20000 as follows 167 2 43 dB 124 2 dB This calculation provides a result only 2 dB different from the 20 Hz to 20 kHz unweighted measurement cited above 26 evaluationengineering com June 2015 a et Cc CCC Positive Negative i Poeutred impak Peba aiad rera polanny Maguire gaha criporce bedn Hia teari peili Teie Pow Poley m comest MeL 5 4 i ie a it Pr aT PL ir 7 em a Figure 12 Using an impulse response to check polarity cies The blue trace is the THD N ratio distortion products of the 3 kHz audio tone which remains
79. r of product marketing and software applications at the company said With the capability to test waveforms vs a pass fail mask or a standard trace on thousands of data frames at a time the onboard waveform analysis features save the engineer considerable time pinpointing their underlying problem Once the glitch or signal has been analyzed and correlated with logic signals users can then utilize the embedded source channels to emulate and verify individual signals within the system Figure 2 An optional Arb is available on selected models Nevertheless update speed is not the entire answer R amp S Markley also discussed the need for both time and frequency domain capabilities He said Issues may be more easily seen in the frequency domain than in the time domain but often to see them you need to be able to process the time domain signal into the frequency domain quickly Using hardware to do both digital down conversion and calculating the spectrum of a signal greatly increases the chances of finding those elusive events A scope s history function was one of the features Yokoga wa s William Chen product marketing high frequency in struments mentioned He said The history feature solves the issue of how to quickly isolate the problem waveform from all the previously acquired waveforms Using the history search function users can quickly isolate analyze and precisely cat egorize abnormal wavefo
80. re fast clean and accurate and can be set to standard logic levels Random jitter lt 1 ps rms 80 ps rise and fall times How fast Frequency to 2 05 GHz with rise and 16 digit frequency resolution fall times as short as 80 ps CMOS LVDS ECL PECL RS 485 Jitter i than 1 h Phase adjustment amp time modulation How clean Jitter is less than 1 ps and phase noise is better than 90 dBc Hz 100 Hz offset at 622 08 MHz How accurate Using the optional rubidium timebase aging is better than 0 0005 ppm year and temperature stability is better than 0 0001 ppm You would expect an instrument this good to be expensive but it isn t You no longer have to 200 8 aN div D A Naiv B D aN buy an rf synthesizer to generate clock signals Y yY g g The CG635 does the job better at a fraction of Plot shows complementary clocks and PRBS opt 01 the cost outputs at 622 08 Mb s with LVDS levels Traces have transition times of 80 ps and jitter less than 1 ps rms Stanford Research Systems SRS Phone 408 744 9040 Fax 408 744 9049 info thinkSRS com www thinkSRS com IESS R SOLUTIONS PXI Semiconductor Test System A TE i ai n TET Gi ait ia Ta Ta Ta T ET ET om n eae Be ae fi ERE HE as amp eT Te Ts TTT i G Ta Tie See CE NS AE CM a n gt ce za moe m e me cofa mr pm maa Pig gi gi bdie eam aaa My ries iil F
81. resolution results But the measurement runs slower than before to process more data 10 000 samples instead of the original 50 Start frequency stop frequency center frequency and span controls An important capability in the FFT calculation and resultant view is to be able to zoom into an area of interest for analysis The first example had a wide span from 0 Hz to 2 5 GHz so it was difficult to see any detail around the 600 MHz carrier Suppose there was suspected noise around the 600 MHz car rier frequency and a desire to inspect that The FFT controls can set a center frequency at 600 MHz and a desired span such as 100 MHz around the 600 MHz carrier A start frequency of 550 MHz and stop frequency of 650 MHz also could have been se lected with the same result An FFT measurement with these parameters can be seen in Figure 3 Figure 3 FFT of 600 MHz sine wave input when FFT controls set for a 600 MHz center frequency and 100 MHz span Wideband FFT analysis An increasing number of today s signals have modulation pres ent that can increase the spectral width to hun dreds of megahertz or even multiple gigahertz If spectral widths of signals are beyond around 500 MHz then spectrum analyzers or vector signal analyzers available today do not have enough analysis bandwidth to make meaning ful measurements In such cases an oscilloscope or digitizer is required that has enough analysis
82. rformance you need for various EMC requirements and TWTA replacements Features and Benefits abound Excellent Linearity unlike their TWTA counterparts Harmonics gt 20 dBc for more accurate measurements e Lower Life Cycle Costs than TWTA s e More Power Delivered to Poor Loads e Much Lower Noise Figure Additional Output Power levels Available 100 250 500 1000 and 2000 Watts To learn more visit us at www arworld us anotherFirst or for technical support call toll free at 800 933 8181 ISO 9001 2008 Certified rf microwave instrumentation www arworld us Other r divisions modular rf receiver systems ar europe Copyright 2015 AR USA 215 723 8181 For an applications engineer call 800 933 8181 The orange stripe on AR products is In Europe call ar United Kingdom 44 1908 282766 ar France 33147917530 ar Deutschland 49 6101 802700 ar Benelux 31 172 423000 Reg U S Pat amp TM Off Visit www rsleads com 506ee 001 June 2015 Vol 54 No 6 CONTENTS INSTRUMENTATION June 2015 Written by Engineers for Engineers EVALUATION ENGINEERING SPECIAL REPORTS Oscilloscopes SENSORS Increased insight through Convergence drives innovative technology sensor proliferation Remote Monitoring l MEDICAL TEST Communications service providers Strict EMC rules aim for secure look to test solutions healthcare environment www evaluationengineering com On our cover Designed by NP Communicatio
83. rms without needing to carefully con figure complex triggers Chen also commented on the benefits of built in serial bus triggering and analysis features found in many scopes For ex ample GWInstek s Roger Lee marketing and service depart ment said Serial bus functions help users utilize the GDS 2000E or GDS 1000B scopes to observe waveforms trigger signals and analyze low speed serial buses PC SPI UART and CAN LIN These types of communications buses often are used in automotive applications Rather than attempting to choose the most important among a scope s features Trevor Smith business development manager at Pico Technology said PicoScope provides good Famous last words Any calibration will do With Keysight calibrations you can count on the accuracy of your electronic measurement equipment guaranteed We test the actual performance of every warranted specification and every installed option every time And if an instrument is out of spec we zero in on the problem and make all necessary adjustments How can you be sure Because we provide a complete data report so you know exactly what is done and why PRODUCT RECALLS amp REJECTS Keysight Calibration amp Repair Services Equipment restored to data sheet specs Service locations and mobile teams deployed worldwide Automated tests networked for global consistency Measurement results for all tes
84. rum lines in the FFT or the width of frequency buckets that signal energy is appor tioned to is called the frequency resolution It is based strictly on the time length of the acquired data and a factor for the FFT windowing type selected A rectangular window is used here with a factor of 1 so the frequency resolution is simply the in verse of the record time In this example Frequency Resolution 1 1 ns div x 10 div 100 MHz So this FFT could distinguish frequency components in the sig nal spectrum as close as 100 MHz but any components closer than 100 MHz apart would merge together and be indistin euishable That s actually a really coarse measurement How an increased time on screen enhances the FFT response To demonstrate the importance of the record time upon FFT re sults if the time division is panned to 200 ns div with a new record time of 2 us across the screen the frequency resolution changes drastically to Frequency Resolution 1 200 ns div x 10 div 500 kHz Av KEYSIGHT InfiniiVislon MSO M 3704 T Miad signal Oumosops 10Hz 8 6 OSes Figure 2 Time domain capture at 200 ns div and resultant FFT calcula tion with a 600 MHz sine wave input The significant change in the FFT result can be seen in Figure 2 with a much finer display of the 600 MHz frequen cy domain spike A trade off is happening here More time samples are being processed the calculated FFT has more spectral lines and better frequency
85. s are 224 40 per year Current single copies if available are 15 40 each U S 19 80 international Back issues if available are 1760 each U S and 22 international Payment must be made in U S funds ona branch of a U S bank within the continental United States and accompany request Subscription inquiries subscriptions npcomm com Title registered U S Patent Office Copyright 2015 by NP Communications LLC All rights reserved No part of this publication may be reproduced or transmitted in any form or by any means electronic or mechanical including photocopy recording or any information storage and retrieval system without permission in writing from the publisher Office of publication Periodicals Postage Paid at Sarasota FL 34276 and at additional mailing offices Postmaster Send address changes to EE EVALUATION ENGINEERING P O BOX 17517 SARASOTA FL 34276 0517 2 evaluationengineering com June 2015 Redefining Automated Test with open software and modular hardware mo bei ipei e fiba j Sa th Co eee Duper Tpacirem ek i a m W o paiay H MI map j o z tind w F t H i a is Hir Bie Tra a F r nba bhna PE iam fice Fian hence ai d Through an intuitive How we interact with devices is changing As the world becomes more software graphical programming oriented what we can accomplish increases exponentially This shift should approach NI LabVIEW reduces test
86. s may be required because of the need to consider all possible EMC risks in the risk analy sis Advance planning will help make the compliance process and any design alterations if necessary less stressful and less likely to cause delays in getting products to market EE About the Author Bruce Fagley is the EMC technical and operations manager EMC East at TUV Rheinland responsible for technical matters of the company s five North American EMC facilities and operations of three EMC laboratories in the East Fagley began his EMC career 30 years ago as an international compliance engineer and his employment at TUV Rheinland spans 20 years He is the author of several articles on EMC matters and the EMC notified body representative for TUV Rheinland of North America bfagley us tuv com mm 5 a i Y pa Tini TEE h oH O en SWITCHING SYSTEMS HIGH SPEED DIGITAL ATE EMC CLOUD COMPUTING ATE Se en a ee a O ODO OPTICAL COMMUNICATIONS TEST Laser scope and calibration instruments debut at OFC UN 36 evaluationengineering com By Rick Nelson Executive Editor cently in Los Angeles The event which show orga nizers describe as the largest global conference and exposition for optical communications and networking profes sionals attracted 12 375 registered attendees and 560 exhibi tors occupying 106 000 square feet of exhibit space We couldn t be happier to cosponsor a conference
87. s operating above 400 MHz require testing above 1 GHz for emissions Testing for immunity below standard levels Manufacturers will likely find it more challenging now to speci fy immunity levels lower than standard levels in their test plans and justify them via risk management Annex E in IEC 60601 1 2 describes how to justify immunity test levels deviating from the standard The explanation will need to consider the envi ronment of use For example equipment designed specifically EVALUATION ENGINEERING Sha ffx m lt MEDICAL TEST for use in a humidity controlled environment may be allowed to meet lower ESD immunity levels Is it going to cost more The fourth edition will require some additional testing thereby adding costs If manufacturers provide the lab with the test plan based on their risk analysis during the quoting stage the lab can respond with the most accurate estimates In instances where the product was recently tested to the third edition the manufacturer may be able to limit its testing to the differences per the fourth edition Naturally some products may still need to be completely retested if their risk analysis includes addi tional EMC risks Next steps Manufacturers are advised to evaluate their designs now for fu ture compliance particularly if they have several products that will all need to be retested at some point In some instances testing to additional EMC standard
88. s with 8 in WCGA LCD integrated generator 14Mpt memory very low noise floor FREE carry case available DS2000A series FREE TECH SUPPORT GREAT CUSTOMER SERVICE Ls Visit www rsleads com 506ee 010 MM SPECIAL REPORT Figure 4 MaxTester 635 Courtesy of EXFO For its part Ixia announced earlier this year that it is leveraging virtual ization to help enterprise IT depart ments ensure security resilience The company said its BreakingPoint secu rity resilience solution now is avail able as virtualized software Offering an elastic deployment model the new BreakingPoint Virtual Edition pro vides enterprise IT departments with the high fidelity real world valida tion that vendors and service provid ers use to ensure network security resilience Ixia also released a study find ing that virtualization technology could pose hidden dangers within enterprise networks with only 37 of survey respondents reporting that they monitor their virtualized envi ronments in the same manner as their physical environment Nevertheless the study finds that virtualization adoption will continue over the next two years with companies maintain ing or increasing their monitoring ca pabilities In other news at the Mobile World Congress JDSU highlighted products that help service providers optimize the quality of LTE mobile video and virtualized networks The company introduced a scalable real time per formance moni
89. t during the noise measurement IEC 61606 recommends a simi lar method but calls the measurement dynamic range Figures 5 and 6 show a comparison of the signal to noise measurements of two 24 bit DACs operating at 96 kS s using this method As can be seen some converter designs are much more effective than others Chl 101 275 dB O 2040 odina 100 120140 Figure 6 SNR for DAC C Glossary AES Audio Engineering Society with headquarters in New York City AES3 S PDIF In the consumer and professional audio field digital audio typically is carried from point to point as a biphase coded sig nal commonly referred to as AES3 AES EBU or S PDIF There are electrical and bit stream protocol differences among the variations of biphase coded digital audio but the various signals are largely compatible Variations are defined in the standards AES3 IEC 60958 and SMPTE276M Anti alias filter In sampled systems the bandwidth of the input has to be limited to the folding frequency to avoid aliasing Modern audio ADCs normally have this anti alias filter implemented with a combination of a sharp cutoff finite impulse response FIR digital filter and a simple low order analog filter The digital filter operates on aversion of the signal after conversion at an oversampled rate and the analog filter is required to attenuate signals that are close to the oversampling frequency This analog filter can have a relaxed response since the overs
90. t by N fast sampling intervals as can happen in boxcar averaging A moving average is a type of FIR filter with equally weight ed taps A LeCroy application brief discussed the advantages of using a different filter tap weighting that trades slightly less improvement in noise reduction against much better frequency response characteristics Specifically the LeCroy ERES FIR filter tap weighting implements a shape similar to an FFT window ing function nearly unity in the center but tapering off toward zero at the edges The bell shaped filter characteristic in the time domain has an equivalent Gaussian shape in the frequency domain The end result is that Gibbs ringing is eliminated The same degree of smoothing and resolution enhancement can be achieved as with a boxcar average but the number of taps must be increased Markley at R amp S discussed the approach taken in the com pany s RTO DSO to enhance resolution He said We use digital filtering that eliminates the drawbacks of averaging and high resolution Because it is also done in hardware prior to our digital trigger the trigger can see the higher resolution data and trigger on it By achieving up to 16 bits of verti cal resolution this can greatly enhance the capability to see small signal details that may have a big impact on the device under test Figure 3 Infiniium S Series Oscilloscope with eyediagram and jitter analysis histograms Courtes
91. the Unit ed States and Canada and it has been reported that the U S Food and Drug Administration FDA already not only accepts the fourth edition but asks for it on new 510 k applications The compliance date for the European Union has not yet been announced but is expected shortly some in the industry specu late it may be August 2017 This article explains the fourth edi tion s technical changes and how they will affect the testing and certification process piw is better than cure and the fourth edition of ECG machine which would need to meet new EMC rules if brought to market in April 2017 A new EMC paradigm Medical device manufacturers will notice that the fourth edi tion s technical changes stem from the new EMC paradigm Tests and limits are set according to risk and intended use not according to a device type The environment of intended use must be specified in the test report and can include a health care facility home and a special environment such as military heavy industrial or medical treatment area with high powered medical equipment The home environment comprises almost everything except the healthcare facility such as restaurants shops schools churches libraries vehicles train and bus sta tions airports hotels and museums Medical devices will be tested based on their intended use and equipment designed for special environments may need to be tested for immunity at levels higher or lower tha
92. the four slot and eight slot CompactDAO controllers feature an Intel Atom dual core processor that can run ei ther Windows Embedded 7 or NI Linux Real Time By pairing industry standard OS options with LabVIEW system design software customers can easily port LabVIEW code from ex isting measurement systems to these new CompactDAO con trollers They can combine LabVIEW and more than 60 sensor specific I O modules for CompactDAQ to quickly customize data acquisition systems to meet their application needs National Instruments www rsleads com 506ee 204 Sound and Vibration System LE VIBbox is a complete portable system with 64 IEPE input chan nels eight stimulus D A channels four tachometer channels and a plethora of digital I O counter tim er and measure counter channels Being a parallel measurement sys tem VIBbox features simultaneous measurement from all channels IEPE inputs from sensors such as microphones and accelerometers that have a large dynamic range can be connected directly and executed at a very fast throughput of 105 4 kHz Common applications include audio acoustic and vibration testing VIBbox operates using the ready to measure QuickDAQO application with the Advanced FFT Analysis Option as a standard The easy to use QuickDAQ application acquires data analyzes the data records the data to disk and displays and plots the results VIBbox is available at 24 995 Data Translation www rsleads com 506ee 205
93. ticularly for low level sig nals AES17 and Audio Precision s Technote 124 describe effective testing methods for audio converter measure ments EE References 1 AES17 1998 r2009 AES standard method for digital audio engineering Measurement of digital audio equipment Revision of AES17 1991 2 Peterson S Measuring A to D and D to A Converters with APx555 Audio Precision Technote 124 2015 About the author David Mathew is technical publications manager and a senior technical writer at Audio Precision He has worked as both a mixing engineer and as a technical engineer in the recording and film making industries and was awarded an Emmy for his sound work in 1988 davem ap com Touch Discover Solve AW KEYSIGHT insindvision DS0 x 31047 Bo Soomntnan 16e So mena 010 Oscilloscopes redefined We ve Improved on the proven The new Keysight 3000T aie Model Keysight Tektronix oscilloscope is the next generation of the InfiniiVision is 3000T X Series MD03000 Series X Series With its zone touch triggering you can trigger Bandwidth 100 MHz 1 GHz 100 MHZ 1 GHz on any signal in just two steps So you can Isolate a signal in seconds much faster than with any competing scope Update Rate Uncompromised 1M wfms s Up to 280K wims s The 30007 is also a 6 in 1 instrument Along with your Touch Screen _8 9 inch Capacitive No oscilloscope you can get an MSO WaveGen function Zone Touch Yes
94. toring and problem segmentation solution for Ethernet networks and it upgraded its Video Service Assurance product line cre ating a software based solution that monitors operators video services end to end from the video source to the end device as part of a multiser vice assurance solution 20 evaluationengineering com June 2015 A Sponsored by G Communications I nc Handheld testers meet cloud Fluke Networks recently unveiled Link Solutions a combination of net work testers and cloud based reporting Based on Fluke Networks LinkRunner and LinkSprinter hand held network testers Link Solutions provides a cohe sive way for PC and front line techni cians field managed IT teams system integrators and VARs to conduct cop per fiber and Ethernet tests and then manage their test results regardless of which testers they used via a unified cloud based dashboard And EXFO announced that it has entered into a reseller agreement with Teletech an Australian telecom test equipment manufacturer with regard to the latter s TS125 Remote Far End Device digital line test set This reseller agreement paves the way toward a so lution for operators and contractors with existing methods and procedures in place where the use of a far end de vice FED complements their copper pair quality testing Coupled with the EXFO MaxTester 600 series in particular the MaxTester 610 and MaxTester 635 Figure 4
95. ts performed Learn more and download example Cal Certificates at www keysight com find SeeTheWork KEYSIGHT TECHNOLOGIES USA 800 829 4444 CAN 877 894 4414 Unlocking Measurement Insights Keysight Technologies Inc 2015 Agilent s Electronic Measurement Group is now Keysight Technologies 14 evaluationengineering com Ted PN OSCILLOSCOPES ___ TWLNOZISOH l Figure 2 Intensity graded UltraVision display showing infrequent glitch Courtesy of Rigol Technologies general purpose capability including decoding for many se rial standards automated measurements and acquisition and display modes that are optimized for tasks such as glitch cap ture through to waveform streaming for ultradeep waveform analysis and unattended system monitoring applications Although all scope vendors acknowledge the importance of a wide range of capabilities one scope will perform at a higher level than another in certain applications depending on which aspects the manufacturer has emphasized and how they have been implemented Enhanced Capabilities Power Many user applications have such specific characteristics that suites of scope capabilities have been developed to address them Rigol s Armstrong listed power analysis as a key applica tion for the company It is addressed by adding the UltraPower Analyzer Software option to either the 2000A or 4000 Series The option comes complete with a deskew board so users can acc
96. uplers various active Si devices and high speed Ge photodetectors paving the way to industrial adoption of optical transceivers based on this device This achievement is a milestone for realizing silicon optical transceivers for datacom applications at 50 Gb s and beyond stated Joris Van Campenhout program director at imec in a press release We have developed a modulator that addresses the bandwidth and density requirements for future chip level optical interconnects he said Companies can benefit from imec s Silicon Photonics plat form iSiPP25G through established standard cells or by ex ploring the functionality of their own designs in Multi Project Wafer runs The iSiPP25G technology is available via ICLink services and MOSIS a provider of low cost prototyping and small volume production services for custom ICs EE Reference 1 Upbeat Mood at OFC Signals Market Potential OFC Blog March 26 2015 June 2015 evaluationengineering com 37 38 evaluationengineering com EE PRODUCT PICKS Switching System Test Tools The eBIRST diagnostic test tools designed specifically for the vendor s PXI PCI or LXI Ethernet products simplify switching system fault finding by quickly testing the system and identifying the faulty re lays Once the relays are iden tified the tools then display a graphical representation of the switching system s PCB assembly highlighting the re lays that need to b
97. urately align current and voltage probe timing Typically voltage and current probes have very different bandwidths and delays which if not corrected cause the power waveform to be in error The software includes standard tests for power enve lope and efficiency Also related to power LeCroy s Motor Drive Analyzer MDA is a specially adapted HDO8000 12 bit resolution DSO The company has a long history of producing scope based analyzers for special applications such as serial data and disk drive analysis With eight input channels the MDA accommo dates three phases of voltage and current as well as a couple of control lines allowing more complete signal correlation An additional 16 digital channels are optionally available allowing concurrent torque position or further drive signal acquisition Although the MDA includes a user configurable table of power related measurements real apparent and reactive power power factor phase angle efficiency voltage cur rent and motor mechanical quantities the overall accuracy is limited to about 1 by the scope s performance In contrast dedicated power analyzers typically feature 16 to 18 bits of resolution and 0 05 accuracy Of course these instruments June 2015 Sponsored by ROHDE amp SCHWARZ also have limited bandwidth and sampling speed High definition Nicolet Instruments pioneered 12 bit scopes in the 1980s and 1990s These scopes frequently were used in bi
98. used to evalu ate ADCs and DACs These measure ments include frequency response signal to noise ratio SNR interchan nel phase crosstalk distortion group delay and polarity But conversion be tween the continuous and sampled do mains brings a number of new mecha nisms for nonlinearity particularly for low level signals Of course ADCs and DACs are used in a great number of nonaudio applica tions often operating at much higher sampling rates than audio converters Very good oscilloscopes might have bandwidths of 33 GHz and sampling rates up to 100 GS s with prices com parable to a Lamborghini Although audio converters don t sample at any where near that rate they are required Level dBrA to cover a much larger dynamic range with high performance ADCs digitizing at 24 bits and having SNRs greater than 120 dB Even a high end oscilloscope typically uses only an 8 bit digitizer 24 bit conversion pushes the measurement of noise and other small signal perfor mance characteristics to the bleeding edge consequently measurements of such converters require an analyzer of extraordinary analog performance Test setups The typical test setups are straightfor ward For ADC testing Figure 1 the ana lyzer must provide extremely pure stimu lus signals at the drive levels appropriate for the converter input For converter ICs the analyzer must have a digital input in a format and protocol to match the IC outp
99. ut such as PS DSP or a custom for mat For a commercial converter device the digital format typically is an AES3 S PDIF compatible stream For devices that can sync to an external clock the analyzer should provide a clock sync output For DAC testing Figure 2 the ana lyzer must have a digital output in the appropriate format and analog inputs of very high performance The graphs in this article were created by testing commercial converters using the AES3 digital transport The analyzer is the Audio Precision APx555 As mentioned previously ADCs and DACs exhibit behaviors unique to con 10 20 30 40 50 60 70 80 90 100 110 120 130 140 150 AUDIO GENERATOR ANALYZER AESI i SPF PS DSP DIGITAR INPUT DLE SYNE OUTPUT apikal AUDIO GENERATOR ANALYZER AES POF oF Figure 2 DAC test block diagram verters The Audio Engineering Society has recommended methods to measure many converter behaviors in the AES17 standard The following examples ex amine and compare a number of charac teristic converter issues Idle tones Common audio converter architectures such as delta sigma devices are prone to have an idling behavior that produc es low level tones These idle tones can be modulated in frequency by the applied signal and by DC offset which means they are difficult to identify if a signal is present An FFT of the idle channel test output can be used to iden t
100. version of the input signal and the analog filter is required to attenuate signals that are close to the oversampling frequency PCM Pulse code modulation a form of data transmission in which amplitude samples of an analog signal are represented by digital numbers Ul The unit interval is a measure of time that scales with the interface data rate and often a convenient term for interface jitter discus sions The Ul is defined as the shortest nomi nal time interval in the coding scheme For an AES3 signal there are 32 bits per subframe and 64 bits per frame giving a nominal 128 pulses per frame in the channel after biphase mark encoding is applied So in our case of a sampling rate of 96 kHz 1 Ul 1 128 x 96000 81 4 ns The Ul is used for several of the jitter specifi cations in AES3 Jitter For ADCs clock jitter can occur within the converter and synchronization jitter can be contributed through an external clock sync input For DACs receiving a signal with an embedded clock such as AES3 or S PDIF interface jitter on the incoming signal must be attenuated Sinusoidal jitter primarily affects the audio signal by creating modulation sidebands frequencies above and below the original audio signal More complex or broadband jitter will raise the convert er noise floor A common measurement that reveals jitter susceptibility is to use a high frequency sinusoidal stimulus and examine an FFT of the converter output
101. y of Keysight Technologies Both Keysight s 9000H and the newer Infiniium S Series DSOs are capable of 12 bit resolution The 9000H uses an 8 bit ADC and DSP techniques to improve resolution The S Series scopes Figure 3 have 10 bit ADCs and offer 12 bits in hi res mode Noise has been considerably reduced in the newer models For example on the 10 mV div range with 1 GHz bandwidth the S Series AC rms noise floor is 110 uV compared to 181 pV in the 9000H Similar improvements have been made at all attenuator settings Power Conversion Hipot Safety Component Test Instrumentation amp Automated Test Systems SPECIAL REPORT OSCILLOSCOPES Pico Technology s 5000 Series DSOs provide extensive speed resolution trade offs As explained on the company s website The PicoScope 5000 scopes have a significantly dif ferent architecture in which multiple high resolution ADCs can be applied to the input channels in different series and parallel combinations to boost either the sampling rate or the resolu tion The result is an 8 bit to 16 bit range of resolution and a corresponding range of sampling rates from 1 GS s to 62 5 MS s respectively Standards compliance tools As stated on the R amp S website Jitter measurements are re quired for characterization and debugging of fast clock and data signals Serial high speed data interfaces such as USB 2 0 LVDS HDMI or PCI e require a special approach for jitter mea surements

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