UM10453 2-Tone Test BGU7005 and BGU7007 GPS LNA
Contents
1. UM10453_2 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 19 of 22 NXP Semiconductors UM10453 2 Tone Test BGU7005 and BGU7007 GPS LNA 019aab868 lec 1 A mA 2 12 3 8 4 0 40 30 20 10 0 Pin_f1 dBm 1 Vcc 2 85 V 2 Vcc 1 8 V 3 Vec 1 5V BGU7005 GPS LNA EVB 60 Icc f Pin 2 Tone test f 1575 MHz f2 1576 MHz f_spur 1574 MHz Fig 26 Tone Test Results Test Case 5 BGU7005 019aab869 60 Pout dBm ly 8 20 a 3 1 6 100 40 20 0 20 Pin_f1 dBm Pout_f 2 85V IM3 2f f2 2 85V Pout_f 1 5V Pout_f 1 8V IM3 2f f2 1 5V IM3 2f f2 1 8V Linear Pout_f 2 85V Linear IM3 2f f2 2 85V CSAS o ees Ne A A E E oO BGU7005 GPS LNA EVB 60 Icc f Pin 2 Tone test f 1575 MHz fo 1576 MHz f_spur 1574 MHz Fig 27 2 Tone Test Results Test Case 5 BGU7005 Table 7 Results Test case 5 Third Order Intercept Points Temp 25 C DUT DUT DUT DUT DUT DUT Vsup Isup Pin _f Pout_f Gp DUT f IM3 2f f2 OIP3 2fi f2 IP3_ 2f1 f2 Type EVB V mA dBm dBm dB dBm dBm dBm BGU7007 166 1 5 10 52 29 84 9 81 20 03 57 24 13 80 6 23 BGU7007 166 1 8 10 77 29 84 9 72 20 12 56 60 13 612. 32 45 6 45 16 84 BGU7005 60 1 5 7 39 29 84 20 65 9 19 33 65 7 65 16 84 BGU7005 60 1 8 7 52 29 84 20 60 9 24 33 84 7 36 16 60 BGU7005 60 2 85 836 29 84 20 30 9 54 35 10 5 50 15 04 UM10453_2 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 14 of 22 NXP Semiconductors U M1 0453 2 Tone Test BGU7005 and BGU7007 GPS LNA 5 3 Test Case 3 Generators f4 824 6 MHz f 2400 MHz Spectrum Analyzer Second Order Product fspur 1575 4 MHz The figures below give the measured results of the 2 Tone test for BGU7007 and BGU7005 EVB s a 0019aab858 3 019aab859 lcc T mA M Pout 8 12 a dBm F 10 8 20 6 4 40 2 0 60 40 30 20 10 0 40 30 20 10 0 10 Pin_f1 dBm Pin_f1 dBm 1 Vcc 2 85 V Pout_fi 2 85V 1 2 Vec 1 8V 2 IM2 fo f 2 85V 3 Vec 1 5V 3 Pout_f 1 5V 4 Pout_f 1 8V BGU7007 GPS LNA EVB 168 Icc f Pin 2 Tone test 5 IM2 fo f 1 5V f 824 6 MHz f2 2400 MHz f_spur 1575 4 MHz 6 IM2 fo f 1 BV 7 Linear Pout_f 2 85V 8 Linear IM2 f2 f 2 85V BGU7007 GPS LNA EVB 166 2 Tone test f 824 6 MHz fo 2400 MHz f_spur 1575 4 MHz Fig 16 Tone Test Results Test Case 3 BGU7007 Fig 17 2 Tone Test Results Test Case 3 BGU7007 UM10453
3. 6 52 BGU7007 166 285 11 6 29 84 9 65 20 19 58 90 14 85 5 34 BGU7005 60 15 964 29 84 12 30 17 54 62 50 12 70 4 84 BGU7005 60 18 99 29 84 12 05 17 79 62 00 12 80 4 99 BGU7005 60 2 85 11 05 29 84 11 85 17 99 63 50 13 85 4 14 UM10453_2 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 20 of 22 NXP Semiconductors UM10453 6 Legal information 2 Tone Test BGU7005 and BGU7007 GPS LNA 6 1 Definitions Draft The document is a draft version only The content is still under internal review and subject to formal approval which may result in modifications or additions NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information 6 2 Disclaimers Limited warranty and liability Information in this document is believed to be accurate and reliable However NXP Semiconductors does not give any representations or warranties expressed or implied as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information In no event shall NXP Semiconductors be liable for any indirect incidental punitive special or consequential damages including without limitation lost profits lost savings business interr
4. 05 60 1 5 6 33 29 84 20 60 9 24 41 10 1 20 8 04 BGU7005 60 18 648 29 84 20 50 9 34 41 16 1 46 7 88 BGU7005 60 2 85 7 34 29 84 20 10 9 74 42 40 3 50 6 24 UM10453_2 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 16 of 22 NXP Semiconductors U M1 0453 2 Tone Test BGU7005 and BGU7007 GPS LNA 5 4 Test Case 4 Generators f 1575 MHz fo 1576 MHz Spectrum Analyzer Third Order Product fspur 1574 MHz The figures below give the measured results of the 2 Tone test for BGU7007 and BGU7005 EVB s 46 019aab862 40 019aab863 Pout lcc dBm 8 mA 20 i 1 3 a o a lt 4 o 20 8 a 40 2 80 2 5 80 0 100 40 30 20 10 0 40 20 0 Pin_f1 dBm Pin_f1 dBm 1 Vcc 2 85 V Pout_fi 2 85V 1 2 Vcc 1 8 V 2 IM3 2f1 f2 2 85V 3 Vec 1 5V 3 Pout_f 1 5V 4 Pout_f 1 8V BGU7007 GPS LNA EVB 166 Icc f Pin 2 Tone test 5 IM3 2f f2 1 5V f 1850 MHz f2 5275 MHz f_spur 1575 4 MHz 6 IM3 2f f2 1 8V 7 Linear Pout_f 2 85V 8 Linear IM3 2f1 f2 2 85V BGU7007 GPS LNA EVB 166 2 Tone test f 1850 MHz fo 5275 MHz f_spur 1575 4 MHz Fig 20 Tone Test Results Test Case 4 BGU7007 Fig 21 2 Tone Test Results Test Case 4 BGU7007 UM10453_2 All inform
5. 4 gives an overview of the frequency spectrum caused by second and third order intermodulation in a 2 Tone test power A po po2 IM2LsB IM3_sB IM3ysB IM2UsB T T gt freq fo fy 2f1 f fi fa 2f2 f4 fo fy 0198ab846 Fig 4 O IIP3 at Vcc 1 5 V 1 8V and 2 85 V Several cases can be found for which one of the above conditions is valid In this document 5 test cases will be discussed in more detail Table 1 gives the five cases The fspur Component which falls inside the GPS band is high lighted Table 1 Test cases Out of Band Input Second and Third Order Intercept Point Test Signal Signal IM2 ss IM3 ss Input Input IM3uss IM2uss case Type f Type f2 Comp Comp Tone 1 Tone 2 Comp Comp f2 f4 2f1 f2 f f2 2f2 f1 fo fi MHz MHz MHz MHz MHz MHz 1 UMTS FDD GSM1800 138 1575 42 1713 42 1851 42 1989 42 3564 84 2 LTE LTE 0 6 786 8 787 4 788 788 6 1575 4 3 GSM900 BT WLAN 1575 4 750 8 8246 2400 3975 4 3224 6 4 GSM1800 WLAN 3425 1575 1850 5275 8700 7125 5 GPS GPS 1 1574 1575 1576 1577 3151 UM10453_2 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 5 of 22 NXP Semiconductors U M1 0453 UM10453_2 2 Tone Test BGU7005 and BGU7007 GPS LNA The two carriers in the Table 1 f4 and fz can be seen as two TX jammers for example in UMTS FDD and GSM1800 cell phone systems One of the thir
6. 5 85 29 84 12 90 16 94 86 70 23 30 6 36 BGU7005 60 18 88 29 84 12 70 17 14 87 60 24 00 6 86 BGU7005 60 285 9 9 29 84 12 40 17 44 90 50 25 95 8 51 UM10453_2 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 12 of 22 NXP Semiconductors UM10453 5 2 Test Case 2 Generators f 787 4 MHz fo 788 MHz 2 Tone Test BGU7005 and BGU7007 GPS LNA Spectrum Analyzer Second Order Product fspur 1575 4 MHz The figures below give the measured results of the 2 Tone test for BGU7007 and BGU7005 EVB s 14 0019aab854 i 2 3 ma 1 10 40 30 20 10 0 Pin_f1 dBm 1 Veco 2 85 V 2 Vec 1 8V 3 Vec 1 5V BGU7007 GPS LNA EVB 166 Icc f Pin 2 Tone test f 787 4 MHz fo 788 MHz f_spur 1575 4 MHz Fig 12 Tone Test Results Test Case 2 BGU7007 30 Pout dBm 10 019aab855 8 h 5 3 4 40 30 20 10 0 10 Ne eee oo A Do e o S re ONS BGU7007 GPS LNA EVB 166 2 Tone test f1 787 4 Fig 13 2 Tone Test Results Test Case 2 BGU7007 Pin_f1 dBm Pout_f 2 85V IM2 fo f 2 85V Pout_f 1 5V Pout_f 1 8V IM2 fo f1 1 5V IM2 fo f 1 8V Linear Pout_f 2 85V Linear IM2 fo f 2 85V MHz f2 788 MHz f_spur 1575 4
7. 7005 60 1 5 6 05 29 85 14 84 15 01 91 30 9 71 5 30 BGU7005 60 1 8 6 18 29 85 14 68 15 17 91 80 10 07 5 10 BGU7005 60 2 85 7 29 85 14 29 15 56 92 80 10 96 4 60 UM10453_2 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 18 of 22 NXP Semiconductors U M1 0453 2 Tone Test BGU7005 and BGU7007 GPS LNA 5 5 Test Case 5 Generators f 1575 MHz fo 1576 MHz Spectrum Analyzer Third Order Product fspur 1574 MHz The figures below give the measured results of the 2 Tone test for BGU7007 and BGU7005 EVB s ie 019aab866 019aab867 7 lcc Pout mA dBm 12 1 20 bi ONK 2 a 3 5 8 20 A 6 2 4 60 0 100 40 30 20 10 0 40 20 0 Pin_f1 dBm Pin_f1 dBm 1 Vcc 2 85 V Pout_fi 2 85V 1 2 Vcc 1 8 V 2 IM3 2f1 f2 2 85V 3 Vcc 1 5V 3 Pout_f 1 5V 4 Pout f 1 8V BGU7007 GPS LNA EVB 166 Icc f Pin 2 Tone test 5 IM3 2f f2 1 5V f1 1575 MHz fo 1576 MHz f_spur 1574 MHz 6 IM3 2f f2 1 8V 7 Linear Pout_f 2 85V 8 Linear IM3 2f1 f2 2 85V BGU7007 GPS LNA EVB 166 Icc f Pin 2 Tone test f 1575 MHz f2 1576 MHz f_spur 1574 MHz Fig 24 Tone Test Results Test Case 5 BGU7007 Fig 25 2 Tone Test Results Test Case 5 BGU7007
8. MHz UM10453_2 All information provided in this document is subject to legal disclaimers User manual Rev 2 15 October 2012 NXP B V 2012 All rights reserved NXP Semiconductors UM10453 2 Tone Test BGU7005 and BGU7007 GPS LNA 019aab856 1 lcc mA 12 D 2 3 8 4 0 40 30 20 10 0 Pin_f1 dBm 1 Veco 2 85 V 2 Vcc 1 8 V 3 Vec 1 5V BGU7005 GPS LNA EVB 60 Icc f Pin 2 Tone test f1 787 4 MHz fo 788 MHz f_spur 1575 4 MHz Fig 14 Tone Test Results Test Case 2 BGU7005 019aab857 7 8 2 0 10 Pin_f1 dBm Pout_f 2 85V IM2 f2 f1 2 85V Pout_f 1 5V Pout_f 1 8V IM2 fo f1 1 5V IM2 fo f 1 8V Linear Pout_f 2 85V Linear IM2 fo f 2 85V A Q oy aal S sah r ee t aa ai SUS Ar ep BGU7005 GPS LNA EVB 60 2 Tone test f1 787 4 MHz fo 788 MHz f_spur 1575 4 MHz Fig 15 2 Tone Test Results Test Case 2 BGU7005 Table 4 Results Test case 2 Second Order Intercept Points Temp 25 C DUT DUT DUT DUT DUT DUT Vsup Isup Pin_f Pout fi Gp DUT f IM2_ fo f OIP2 fo f IIP2_ fo f Type EVB V mA dBm dBm dB dBm dBm dBm BGU7007 166 1 5 75 29 84 19 80 10 04 31 25 8 35 18 39 BGU7007 166 1 8 7 65 29 84 19 80 10 04 31 36 8 24 18 28 BGU7007 166 285 8 37 29 84 19 45 10 39
9. MHz see Table 1 019aab849 Fig 7 _BGU7005 and BGU7007 evaluation board including its connections UM10453_2 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 10 of 22 NXP Semiconductors U M1 0453 2 Tone Test BGU7005 and BGU7007 GPS LNA 5 Typical Evaluation Board results 5 1 Test Case 1 Generators f 1713 42 MHz fo 1851 42 MHz Spectrum Analyzer Third Order Product fspur 1575 42 MHz The figures below give the measured results of the 2 Tone test for BGU7007 and BGU7005 EVB s 46 019aab850 a 019aab851 lcc Pout 7 mA dBm 8 12 20 1 ORGY CNS 2 8 3 20 Oy 6 2 4 60 0 100 40 30 20 40 20 10 0 0 20 Pin_f1 dBm Pin_f1 dBm 1 Voc 2 85V Pout_f 2 85V 1 2 Vec 1 8V 2 IM3 2f1 f2 2 85V 3 Vec 1 5V 3 Pout_f 1 5V 4 Pout_f 1 8V BGU7007 GPS LNA EVB 166 Icc f Pin 2 Tone test 5 IM3 2f1 f2 1 5V f 1713 42 MHz fo 1851 42 MHz f_spur 1 575 42 MHz 6 IM3 2f f2 1 BV 7 Linear Pout_f 2 85V 8 Linear IM3 2f1 f2 2 85V BGU7007 GPS LNA EVB 166 2 Tone test f 1713 42 MHz fo 1851 42 MHz f_spur 1575 42 MHz Fig 8 Tone Test Results Test Case 1 BGU7007 Fig 9 2 Tone Test Results Test Case 1 BGU7007 UM10453_2 All
10. UM10453 2 Tone Test BGU7005 and BGU7007 GPS LNA Rev 2 15 October 2012 User manual Document information Info Content Keywords LNA GPS BGU7005 BGU7007 Linearity Measurements Abstract This document describes 2 Tone Linearity Measurements with the BGU7005 and BGU7007 GPS low noise amplifier evaluation board NXP Semiconductors U M1 0453 2 Tone Test BGU7005 and BGU7007 GPS LNA Revision history Rev Date Description vi 20110311 First release v2 20121015 Updated version Contact information For more information please visit http www nxp com For sales office addresses please send an email to salesaddresses nxp com UM10453_2 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 2 of 22 NXP Semiconductors U M1 0453 2 Tone Test BGU7005 and BGU7007 GPS LNA 1 Introduction UM10453_2 NXP Semiconductors BGU7005 and BGU7007 are low noise amplifiers for GPS receiver applications in a plastic leadless 6 pin extremely thin small outline SOT886 package The typical gain is 16 5 dB for the BGU7005 and 18 5 dB for the BGU7007 Both types have a noise figure of 0 9 dB incl board losses or 0 85 dB board losses subtracted They have a superior linearity performance to suppress interference and noise from co habitation cellular transmitters while retaining sensitivity The GPS LNA evaluation bo
11. _2 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 15 of 22 NXP Semiconductors UM10453 2 Tone Test BGU7005 and BGU7007 GPS LNA 019aab860 lec 1 mA 2 3 12 8 4 0 40 30 20 10 0 Pin_f1 dBm 1 Vcc 2 85 V 2 Vcc 1 8 V 3 Vec 1 5V BGU7005 GPS LNA EVB 60 Icc f Pin 2 Tone test f 824 6 MHz fo 2400 MHz f_spur 1575 4 MHz Fig 18 Tone Test Results Test Case 3 BGU7005 019aab861 7 8 0 4 1 6 20 t 3 5 2 0 20 Pin_f1 dBm Pout_f 2 85V IM2 fo f1 2 85V Pout_f 1 5V Pout_f 1 8V IM2 fo f 1 5V IM2 fo f1 1 8V Linear Pout_f 2 85V Linear IM2 fo f 2 85V U N eS RE A E AA u a BGU7005 GPS LNA EVB 60 2 Tone test f1 824 6 MHz fo 2400 MHz f_spur 1575 4 MHz Fig 19 2 Tone Test Results Test Case 3 BGU7005 Table 5 Results Test case 3 Second Order Intercept Points Temp 25 C DUT DUT DUT DUT DUT DUT Vsup Isup Pin_f Pout f Gp DUT f IM2 fof OIP2 fof IP2_ f f1 Type EVB V mA dBm dBm dB dBm dBm dBm BGU7007 166 1 5 6 64 29 84 19 50 10 34 37 45 1 28 9 06 BGU7007 166 1 8 6 75 29 84 19 45 10 39 37 52 1 56 8 83 BGU7007 166 2 85 7 48 29 84 19 11 10 73 38 71 3 38 7 35 BGU70
12. ards EVB s are designed to evaluate the performance of the BGU7005 and BGU7007 applied as a GPS LNA Fig 1 The application diagram board layout bill of materials and typical results of the EVB s are given in separate application notes about the BGU7005 and BGU7007 This document shows examples of the linearity performance to suppress interference from co habitation cellular transmitters with a 2 Tone test BGU7e85 GPS LNA EVB version 2 1 1 09 019aab843 Fig 1 BGU7005 GPS LNA evaluation board Same board is used for the BGU7007 Note 1 Including PCB losses The BGU7005 and BGU7007 GPS LNA evaluation boards simplify the evaluation of the BGU7005 and BGU7007 GPS LNA s for the GPS applications The evaluation boards enable testing of the device performance and require no additional support circuitry The boards are fully assembled with the BGU7005 or BGU7007 including the input series inductor as well as a decoupling capacitor to optimize the performance The boards are supplied with two SMA connectors for input and output connection to RF test equipment The BGU7005 and BGU7007 can operate from a 1 5 V to 2 85 V single supply and consumes about 5 mA All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 3 of 22 NXP Semiconductors U M1 0453 2 Tone Test BGU7005 and BGU7007 GPS LNA 1 1 A
13. as well as a few of the harmonics so up to 6 GHz should be sufficient Amp meter to measure the supply current optional RF Combiner Proper RF cables The table below gives an overview of the equipment used for the 2 Tone test It can be used as an example which equipment to use Table 2 Equipment used for 2 Tone test Equipment Type Settings RF Generator f R amp S SMA 100A 9 kHz 6 GHz RF Generator fo R amp S SMR20 10 MHz 20 GHz Power Agilent 11667B Splitter Combiner DC 26 5 GHz Spectrum Analyzer HP8595E Res BW 10 kHz Video BW 10 kHz AUTO Video AVG ON 100x Pref 20 dBm Att 10 dB Fcenter Fmeas Fspan 100 kHz Tweep Auto UM10453_2 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 8 of 22 NXP Semiconductors U M1 0453 2 Tone Test BGU7005 and BGU7007 GPS LNA 4 Connections and setup UM10453_2 The BGU7005 and BGU7007 GPS LNA evaluation boards are fully assembled and tested Figure 6 gives an overview of the 2 Tone test setup Please follow the steps below for a step by step guide to operate the evaluation board and testing the device functions 1 Measure the cable and RF Combiner losses at the frequencies which are used during the evaluation to see Table 1 These losses are used to correct the measured power levels 2 Connect the DC power supply to the Vec a
14. ation provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 17 of 22 NXP Semiconductors UM10453 2 Tone Test BGU7005 and BGU7007 GPS LNA 019aab864 lcc 1 mA 2 3 1 Vcc 2 85 V 2 Vcc 1 8 V 3 Vec 1 5V 0 Pin_f1 dBm BGU7005 GPS LNA EVB 60 Icc f Pin 2 Tone test f 1850 MHz fo 5275 MHz f_spur 1575 4 MHz Fig 22 Tone Test Results Test Case 4 BGU7005 40 Pout dBm 20 100 019aab865 8 0 ET 4 6 a 2 5 40 20 Q N eS RE A a A a a Pout_f 2 85V IM3 2f1 f2 2 85V Pout_f 1 5V Pout_f 1 8V IM3 2f f2 1 5V IM3 2f f2 1 8V Linear Pout_f 2 85V 0 20 Pin_f1 dBm Linear IM3 2f f2 2 85V BGU7005 GPS LNA EVB 60 2 Tone test f 1850 MHz fo 5275 MHz f_spur 1575 4 MHz Fig 23 2 Tone Test Results Test Case 4 BGU7005 Table 6 Results Test case 4 Third Order Intercept Points Temp 25 C DUT DUT DUT DUT DUT DUT Vsup Isup _ Pin_f Pout f Gp DUT f IM3 2f f2 OIP3_ 2f1 f2 IP3_ 2f4 f2 Type EVB V mA dBm dBm dB dBm dBm dBm BGU7007 166 15 65 29 85 12 40 17 45 80 50 8 02 9 44 BGU7007 166 18 66 29 85 12 30 17 55 80 70 8 25 9 30 BGU7007 166 285 7 3 29 85 12 10 17 75 83 00 9 60 8 15 BGU
15. ccccccessceeeeseneeeessneeeessseeesseaees 15 5 4 TeSt Case 4 cccccsccccssssrecsssrseeessneessseneeessneees 17 5 5 TeSt Case 5 cccccccccccessseceeseneeeessneeeessseeeeesnees 19 6 Legal information cccssseessseeeeseseeeeneseeneenees 21 6 1 Definitions 0 0 cece cececceeceeeceeeeeeeeeeeeeeeeeeeeeeeeeeeees 21 6 2 DISCIAIMELS cccccccccccceeeeeeeeeeeeeeeeeeeeeeeeeeenenenees 21 6 3 TAGSMALKS ihoirt ees 21 7 CONMLCIUS ease cis seccscsssscttsscteccucsnccecssansersscassecssaccsenses 22 Please be aware that important notices concerning this document and the product s described herein have been included in the section Legal information NXP B V 2012 All rights reserved For more information please visit http www nxp com For sales office addresses please send an email to salesaddresses nxp com Date of release 15 October 2012 Document identifier UM10453_2
16. d order products 2f f2 generated in the LNA due to amplifier third order non linearity s can fall at the desired 1575 42 MHz frequency as follows 2f1 fo 2 1713 42 MHz 1851 42 MHz 1575 42 MHz test case 1 This third order product can influence the sensitivity of the GPS receiver drastically So this third order intermodulation product needs to be as low as possible meaning the out of band intercept point must be as high as possible As an example Fig 5 shows the In and Output IP3 of the BGU7007 at different supply voltages typical values The results of all test cases will be discussed later In Fig 5 the Pin Pout curve and third order spur IM3_ss and their trend lines are given The point where both dashed trend lines meet gives the in and output IP3 019aab847 60 Pout K dBm oips 23 dBm 4A 20 1 4 IIP3 3 dBm 100 40 20 0 20 Pin dBm Pout 2 85V IM3 2f1 f2 2 85V Pout 1 5V Pout 1 8V IM3 2f1 f2 1 5V IM3 2f1 f2 1 8V Linear Pout 2 85V Linear IM3 2f1 f2 2 85V wo Ne ee ee ee ee ee NOOO A ne a E A ere OLS SS oo BGU7007 GPS LNA EVB 166 2 Tone test f 1713 42 MHz f2 1851 42 MHz f_spur 1575 42 MHz Fig 5 O lIP3 at Vcc 1 5 V 1 8 V and 2 85 V All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 Oct
17. f these products are for illustrative purposes only NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification Customers are responsible for the design and operation of their applications and products using NXP Semiconductors products and NXP Semiconductors accepts no liability for any assistance with applications or UM10453_2 All information provided in this document is subject to legal disclaimers customer product design It is customer s sole responsibility to determine whether the NXP Semiconductors product is suitable and fit for the customer s applications and products planned as well as for the planned application and use of customer s third party customer s Customers should provide appropriate design and operating safeguards to minimize the risks associated with their applications and products NXP Semiconductors does not accept any liability related to any default damage costs or problem which is based on any weakness or default in the customer s applications or products or the application or use by customer s third party customer s Customer is responsible for doing all necessary testing for the customer s applications and products using NXP Semiconductors products in order to avoid a default of the applications and the products or of the application or use by customer s third party customer s NXP does not accept any liab
18. ility in this respect Export control This document as well as the item s described herein may be subject to export control regulations Export might require a prior authorization from national authorities Evaluation products This product is provided on an as is and with all faults basis for evaluation purposes only NXP Semiconductors its affiliates and their suppliers expressly disclaim all warranties whether express implied or statutory including but not limited to the implied warranties of non infringement merchantability and fitness for a particular purpose The entire risk as to the quality or arising out of the use or performance of this product remains with customer In no event shall NXP Semiconductors its affiliates or their suppliers be liable to customer for any special indirect consequential punitive or incidental damages including without limitation damages for loss of business business interruption loss of use loss of data or information and the like arising out the use of or inability to use the product whether or not based on tort including negligence strict liability breach of contract breach of warranty or any other theory even if advised of the possibility of such damages Notwithstanding any damages that customer might incur for any reason whatsoever including without limitation all damages referenced above and all direct or general damages the entire liability of NXP Semicond
19. information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 11 of 22 NXP Semiconductors UM10453 2 Tone Test BGU7005 and BGU7007 GPS LNA 019aab852 lcc mA 1 Vcc 2 85 V 2 Vcc 1 8 V 3 Vec 1 5V 0 Pin_f1 dBm BGU7005 GPS LNA EVB 60 Icc f Pin 2 Tone test f 1713 42 MHz fo 1851 42 MHz f_spur 1575 42 MHz Fig 10 Tone Test Results Test Case 1 BGU7005 60 019aab853 Pout dBm 8 20 2 100 40 anana na nan NOONA WwW we NS RE N Ee AA A Pout_f 2 85V IM3 2f1 f2 2 85V Pout_f 1 5V Pout_f 1 8V IM3 2f f2 1 5V IM3 2f f2 1 8V Linear Pout_f 2 85V Linear IM3 2f1 f2 2 85V 0 20 Pin_f1 dBm BGU7005 GPS LNA EVB 60 2 Tone test f 1713 42 MHz fo 1851 42 MHz f_spur 1575 42 MHz Fig 11 2 Tone Test Results Test Case 1 BGU7005 Table 3 Results Test case 1 Third Order Intercept Points Temp 25 C DUT DUT DUT DUT DUT DUT Vsup Isup Pin _f Pout_f Gp DUT f IM3 2f f2 OIP3_ 2f1 f2 IP3_ 2f1 f2 Type EVB V mA dBm dBm dB dBm dBm dBm BGU7007 166 1 5 926 29 84 10 41 19 43 75 90 21 59 2 16 BGU7007 166 18 95 29 84 10 30 19 54 75 80 21 70 2 16 BGU7007 166 285 10 3 29 84 10 10 19 74 77 30 22 75 3 01 BGU7005 60 1
20. nd GND terminals Set the power supply to the desired supply voltage between 1 5 V and 2 85 V but never exceed 3 1 V as it might damage the BGU7007 3 Jumper JU1 is connected between the Vec terminal of the evaluation board and the Ven pin of the BGU7005 or BGU7007 3 Oe RF GENERATOR nol 1 ey RF GENERATOR aa 2 CABLE3 BGU7007 GPS LNA EVB CABLE4 PECTRUM oS CTRU ANALYZER 77 019aab848 Fig 6 2 Tone Test Setup 4 Connect the RF signal generators via the RF combiner to the RF input and the spectrum analyzer to the RF output of the evaluation board See Fig 6 Do not turn on the RF output of the Signal generators yet set it to 30 dBm output power at f1 and f2 see Table 1 set the spectrum analyzer at fspur 1575 MHz see Table 1 center frequency and a reference level of 20 dBm 5 Turn on the DC power supply and it should read approximately 5 mA 6 Enable the RF output of the generators the spectrum analyzer displays a tone of around 95 dBm at fspur 1575 MHz see Table 1 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 9 of 22 NXP Semiconductors U M1 0453 2 Tone Test BGU7005 and BGU7007 GPS LNA 7 Increase the RF output level of the Signal generators of f1 and f2 from 30 dBm to approx 5 dBm and check the spectrum analyzer level at fspur 1575
21. ober 2012 6 of 22 NXP Semiconductors U M1 0453 UM10453_2 2 Tone Test BGU7005 and BGU7007 GPS LNA The formula s to calculate the IP2 and IP3 are taken from literature and given below Formula s IP2 fy OIP2 sg PO PO2 IM2 sp dBm 1 fo OIP2ysg PO2 PO IM2ysp dBm 2 IIP2 OIP2i sg Gp dBm 3 IIP2 OIP2ysg Gps dBm 4 With Gp power gain po pi dB 5 Gpz power gain poz pis dB 6 Formula s IP3 fi OIP3 sp po4 p02 IM3Lsg 2 dBm 7 fo OIP3usp P02 po IM3ygp 2 dBm 8 IIP3isg OIP3usp Gp dBm 9 IIP3usg OIP3isg Gp2 dBm 10 Note The in and output powers in the formula s are for in and output levels of the DUT Therefore the cable losses and RF Combiner losses have to be measured These losses can be used to correct the measured power levels All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 7 of 22 NXP Semiconductors U M1 0453 2 Tone Test BGU7005 and BGU7007 GPS LNA 3 Required Equipment In order to measure the evaluation board the following is necessary DC Power Supply up to 30 mA at 1 5 V to 2 85 V Two RF signal generators capable of generating an RF signal at the jammer frequencies f and f listed in Table 1 An RF spectrum analyzer that covers at least the operating frequency of 1575 MHz
22. pplication Circuit The circuit diagram and EVB layout of the evaluation board are shown below With jumper JU1 the enable pin can be controlled to either to Ves or GND BGU7007 GPS LNA EVB 019aab844 Fig 2 Circuit diagram of the BGU7005 and BGU7007 evaluation board 1 2 Board layout 019aab845 Fig 3 Printed circuit board lay out of the BGU7005 and BGU7007 GPS LNA evaluation board UM10453_2 All information provided in this document is subject to legal disclaimers NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 4 of 22 NXP Semiconductors U M1 0453 2 Tone Test BGU7005 and BGU7007 GPS LNA 2 Out of Band Second and Third Order Intercept Points At the average power levels of 130 dBm that have to be received by a GPS receiver the system will not have in band intermodulation problems caused by the GPS signal itself Strong out of band cell phone TX jammers however can cause linearity problems and result in third order intermodulation products in the GPS frequency band The Out of Band Second and Third Order Intercept Points IIP2 and IIP3 are measured by a two tone measurement where the carriers have been chosen is such a way that one of the following conditions is met 1 Second Order distortion fspur f4 f2 1575 MHz 2 Third Order Distortion fspur 2f4 fo 1575 MHz With fspur is around the center of the GPS band 1575 MHz Figure
23. uctors its affiliates and their suppliers and customer s exclusive remedy for all of the foregoing shall be limited to actual damages incurred by customer based on reasonable reliance up to the greater of the amount actually paid by customer for the product or five dollars US 5 00 The foregoing limitations exclusions and disclaimers shall apply to the maximum extent permitted by applicable law even if any remedy fails of its essential purpose 6 3 Trademarks Notice All referenced brands product names service names and trademarks are property of their respective owners NXP B V 2012 All rights reserved User manual Rev 2 15 October 2012 21 of 22 NXP Semiconductors U M1 0453 2 Tone Test BGU7005 and BGU7007 GPS LNA 7 Contents 1 DATO CU CHION os ecerccss sos cdccte heed does naaran Eanna aaeain 3 1 1 Application Circuit 0 2 cceeeceesceeeeeeeeeeeeeneeenees 4 1 2 Board AV OUL sez isscstssastchevecgecsaesieeceivedacenaiccgeces na 4 2 Out of Band Second and Third Order Intercept POW siscsste cnet cccccscectcesvectsescccedesesssaccccucetsecsnsacecus 5 3 Required Equipment cccsssesssessssensseeeees 8 4 Connections and Setup ccsecsseeseeesseeneeeenees 9 5 Typical Evaluation Board results 05 11 5 1 TeSt Case 1 ccccccccceesseeceeseneeeeeseeeeeesseeeesenees 11 5 2 T St CASe 2 ccccccccccessseeeeseseeeessneeeessseeeessnees 13 5 3 TeSt CasSe 3 cccc
24. uption costs related to the removal or replacement of any products or rework charges whether or not such damages are based on tort including negligence warranty breach of contract or any other legal theory Notwithstanding any damages that customer might incur for any reason whatsoever NXP Semiconductors aggregate and cumulative liability towards customer for the products described herein shall be limited in accordance with the Terms and conditions of commercial sale of NXP Semiconductors Right to make changes NXP Semiconductors reserves the right to make changes to information published in this document including without limitation specifications and product descriptions at any time and without notice This document supersedes and replaces all information supplied prior to the publication hereof Suitability for use NXP Semiconductors products are not designed authorized or warranted to be suitable for use in life support life critical or safety critical systems or equipment nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury death or severe property or environmental damage NXP Semiconductors accepts no liability for inclusion and or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and or use is at the customer s own risk Applications Applications that are described herein for any o
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