Agilent 35670A - weimer
Contents
1. Advanced Analysis Use waterfall displays of octave data for an overview of device noise ver sus time or RPM Display individual frequency bands as a function of RPM or time using the slice marker func tion Alternatively use trace markers to select individual traces for display A pink noise source is available for testing electro acoustic devices Sound Level Meter Measurements Peak hold impulse fast slow and Loa are all provided with optional Real time Octave Measurements All measurements conform to IEC 651 1979 Type 0 Impulse S eoe e e0e gt ERRBRBREGEE Agilent 35670A with option UK4 microphone adapter and power supply Swept Sine Measurements Option 1D2 130 dB Dynamic Range Logarithmic or Linear Sweeps Auto Frequency Resolution While FFT based network analysis is fast and accurate swept sine mea surements are a better choice when the device under test has a wide dynamic range or covers several decades of frequency range Use swept sine measurements to extend the network measurement capabili ties of the 35670A Network Analysis Over a 130 dB Range With traditional swept sine the 35670A is optimally configured to measure each individual point in the frequency response The result is a 130 dB dynamic range With FFT based network analysis all frequency points are stimulated simultaneously and the instrument configures itself to measure the highest amplitude respon2. 1 Channel 130 600 1000 Store Up to Eight Arbitrary FFT 2 Channels 2 50 250 400 Waveforms FFT 4 Channels 2 20 100 200 Test your products using real world 1 3 Octave Spectra 4000 18800 32000 signals Measure a signal in either Time Capture 550 KSamples 2 6 MSamples 4 7 MSamples the time or frequency domain then output it via the arbitrary waveform 1 Conditions Preset with instrument mode source Use math functions and data switchea to channel edit to obtain precisely the output Conditions Preset waveform you need An arbitrary 3 Conditions Preset with instrument mode waveform may be output once or switched to 4 channels repeatedly Conditions Preset with instrument mode switched to octave Standard source types can be optimized for specific applications For example random noise can be Add 1 M byte shaped to improve the effective dynamic range of your measurement Alternatively you can use data edit and math functions to create an arbitrary waveform Use time capture as a digital tape recorder then playback captured signals through the arbitrary waveform source Inst Hode FFT Meas From CH1 and CHe Inputs MEASUREMENT PAUSED IAD Dies lice 5 2643 1 Math functions are used to optimize a burst chirp signal for a frequency response measurement OCTAVE ANALYSIS ORDER ANALYSIS SHE PT SIME CORRELATN ANALYSIS HISTOGRAM TIME 7 6649ms CAPTURE Nonvolatile RAM Option UFF
3. The 35670A supports a variety of GPIB serial and parallel printers and plotters for direct hardcopy output The internal 3 5 inch flexible disk drive stores data instrument states HP GL plots and Agilent Instrument BASIC programs in HP LIF or MS DOS formats for future recall or use on HP workstations or a personal computer Entire display screens can be import ed directly into your word processing program by plotting HP GL files to your named DOS file HP GL files are interpreted and displayed directly by Microsoft s Word for Windows and AMI PRO from Lotus Development Corp Computed Order Tracking Option 1D0 Self contained no ratio synthe sizer or tracking filter required Order Maps Order Tracking RPM or Time Trigger Display RPM Profile Track Up to Five Orders Channel Up to 200 Orders Composite Power RPM Measurements Order tracking facilitates evaluation of spectra from rotating machines by displaying vibration data as a func tion of orders or harmonics rather than frequency All measurement spectra is normalized to the shaft RPM Now you can have order tracking without compromising portability Traditional analog order tracking techniques require external tracking filters and ratio synthesizers With Agilent s computed order tracking algorithm external hardware is gone Inst Hode ORDER Meas From MEASUREMENT PAUSED wr Spec mgp khoe LinMag 7A mapk fdiv 2 ee RS 1K
4. The Agilent 35670A is a portable two or four channel dynamic signal analyzer with the versatility to be several instruments at once Rugged and portable it s ideal for field work Yet it has the performance and func tionality required for demanding R amp D applications Optional features optimize the instrument for trouble shooting mechanical vibration and noise problems characterizing control systems or general spectrum and network analysis Take the Agilent 35670A where it s needed Whether you re moving an instrument around the world or around the lab portability is a real benefit Small enough to fit under an airplane seat the 35670A goes where it s needed But there s more to portability than size Like a nominal 12 to 28 volt dc Agilent 35670A Dynamic Signal Analyzer Product Overview 122 uHz to 102 4 kHz 16 bit ADC The Agilent 35670A shown with four channels option AY6 power input and self contained features that do not require external hardware such as built in piezoelec tric integrated circuit power supply analog trigger and tachometer inputs and optional computed order tracking Versatile enough to be your only instrument for low frequency analysis With the 35670A you carry several instruments into the field in one package Frequency time and ampli tude domain analysis are all available in the standard instrument Build on that capability with options that either add new mea
5. 320mi lpk Real Z ssa Markers are used to annotate shaft speeds at selected points ina run up measurement Run Up and Run Down Measurements Run up and run down measurements of any order are made using external trigger as the phase reference Display the results as bode or polar plots both are available Markers allow convenient notation of important shaft speeds Real Time Octave Measurements Option 1D1 Microphone Adapter and Power Supply Option UK4 Real Time Third Octave to 40 kHz ANSI S1 11 1986 Filter Shapes Microphone Inputs and Power A Weighted Overall SPL RPM or Time Triggered Waterfalls Eliminate the expense and inconve nience of multiple instruments in the field With optional real time octave analysis and the optional mi crophone adapter and power supply you have a complete real time octave analyzer added to your 35670A at a fraction of the cost of a second instrument Now you can carry both your FFT and real time octave analyz ers to the job site in the same hand Real Time 1 3 Octave to 40 kHz on One Channel With two input channels of 1 3 octave real time measurements at frequen cies up to 20 kHz you get all of the information you ll ever need to under stand the noise performance of your product No misinterpreted measure ments because transient components were missed When the frequency range requirement is 10 kHz or less use four channels to characterize spa tial variations For tho
6. Obtain all of the performance of your bench top analyzer in a portable instrument Ease of use Portability versatility and perfor mance are valued attributes but to be really valuable an instrument must also be easy to use The 35670A has a friendly front panel plus online help that s always available to answer your questions An interactive mea surement state lets you configure the instrument setup from a single display Inst Hode FFT Meas From CHL and CH2 Inputs MEASUREMENT PAUSED ale Hi 11 45 Hz Kili Hz Loghag decades Loghag decadese Spectrum Analysis FT based spectrum analyzers such as the 35670A are ideal for measuring the spectra of low frequency signals like speech or mechanical vibration Transient components usually missed with swept frequency analyzers are easily measured and displayed at speeds fast enough to follow trends The 35670A has both the performance and features required to take full advantage of this technology 16 Bits for High Performance With a 16 bit ADC 90 dB typical dynamic range and a real time bandwidth of 25 6 kHz you can be sure nothing will be missed Resolve signals using 100 to 1600 lines resolu tion or for really close in analysis use frequency zoom to resolve signals with up to 61 pHz resolution Use time or RPM arming to develop waterfalls of sequential vibration spectra for trend analysis or for an overview of device vibration Pow
7. Inst ee ee Meas From Capture Buffer MEASUREMENT PAUSED A CH1 Teapture Hi 15 533466 ms re ORDER ANALYSIS CORRELATN ALYSI15 ra oF To g 5 7 2 2 eo eE 1 eed 2 E STOGRKAM dBSPLrmS jarang eee F dB Mag An interval of time capture data has been selected for analysis in the octave mode Using Measurement Results Taking the measurement is only half the job Raw measurement data must be stored recalled printed plotted integrated with other data for analysis and reported The 35670A has a variety of tools to help you finish the job Enhanced Data Transfer Utilities for PCs Standard Data Format SDF Utilities provided with the 35670A allow you to easily move data from the instrument to wherever it s needed For general digital signal processing and filtering translate data files to formats compatible with MATLAB and MATRIX Data Set 58 or ASCII for use in popular spreadsheets For specific applications use application software that reads SDF files directly such as STARModal and STARAcoustics from SMS and CADA PC from LMS Transfer data to and from the 35665A 3566A 3567A 3562A 3563A Use the viewdata feature to display data on your PC or to convert to the HP GL format for transfer to Micro softs Word for Windows or Lotus AMI PRO word processing software Convert between HP LIF and MS DOS formats Read data files into a program Documented Results
8. Use the 1 Mbyte nonvolatile RAM in environments too harsh for the 3 5 inch flexible disk drive The memory functions as a high speed disk for storage of the following information e Instrument Setup States e Trace Data e User Math Definitions e Limit Data e Time Capture Buffers e Agilent Instrument BASIC Programs e Waterfall Display Data e Curve Fit Synthesis Tables e Data Tables Information stored in nonvolatile RAM is retained when the power is off Agilent 35670A Ordering Information Agilent 35670A Dynamic Signal Analyzer Standard Configuration e 1 4 Mbyte 3 5 in flexible disk drive e 1 5 Mbytes user RAM e Impact Cover e Standard Data Format Utilities e AC Power Cord e Operating manual set including Operator s Guide Quick Start Guide Installation and Verification Guide GPIB Programming with the 35670A GPIB Commands Quick Reference GPIB Programmer s Guide e Standard one year warranty Options for the 35670A Opt AY6 1D0 1D1 UK4 1D2 1D3 1D4 102 AN2 UFC UFF 1F0 1F1 1F2 1F3 1F4 1F5 1F6 AX4 100 UK5 0B1 0BU 0B3 1BP W30 Description Add Two Channels four total Computed Order Tracking Real Time Octave Measurements Microphone Adapter and Power Supply Swept Sine Measurements Curve Fit and Synthesis Arbitrary Waveform Source Agilent Instrument BASIC Add 4 Mbytes Memory Add 8 Mbytes Memory Note Only one of option AN2 or UFC may be installed Add 1 Mbyte N
9. ing measurements over more than six response of an accelerometer is frequency decades and a 130 dB k ta checkedin dynamic range this example Source Select the optimum stimulus for each application random noise periodic chirp pink noise fixed sine burst random and burst chirp For zoomed network analysis measurements the source is band translated to match the zoom span at frequencies up to 51 2 kHz An optional arbitrary source lets you test your product using Limits Four Channels option AY6 real world signals A 10 volt dc ite Test network measurements against Test up to three devices simul source offset facilitates tests of an preset limits Up to 800 separate line taneously with a four channel 35670A control systems i l segments are available for setting Channel one is the common reference t Testi upper and lower limits Limits are channel and two three and four are nipete Peete also used for testing spectrum the response channels Alternatively Force and exponential windows measurements select channels one and three as ref allow impact testing for modal and erence channels for two totally inde structural analysis Quality measure pendent network measurements ments are ensured using preview and See option AY6 description for more accept reject during averaging A information 4 mA constant current transducer power supply is built in for true portability Inst Hode FFT Meas From CHi and CH
10. label field are listed for each selected point Inst Hode FFT Meas From CH1 and CHe Inputs MEASUREMENT PAUSED RPM 1748 DACHI Pur Spec Hi 145 Hz Lee mmi lpk LogMag 6 decadesth nmi AHz ACHI Pur apec Entry Label 157 ORD ZHD ORD LogMag Automatic Units Conversion Display vibration data in the units of your choice Select g m sec in sec m s in s m mil inch Kg lb N dyn or pascals as appro priate for your application The instrument automatically converts frequency domain data from specified input transducer units to the units you Select for display For example accelerometer data is automatically converted and displayed as mils when mils are selected Of course dB dBV dBm and volts are available for electrical applications Inst Hode FFT Meas From CH1 and CH2 Inputs MEASUREMENT PAUSED IAB map ky Laghiag Measurement results at key frequencies can be labeled and listed using data table OCTAVE ANALYSIS ORDER ANALYSIS SWEPT SINE CORRELATH ANALYSIS HISTOGRAM of TIME CAPTURE Inst Hode FFT Meas From MEASUREMENT PAUSED RALH1I Par Spec 14K milpkp Loghag 6 decades Harmonic markers are used to calculate the THD of a signal without including the effects of noise uni CH1 OCTAVE ANALYSIS ANALYSIS Simultaneous dis play of frequency and time domain data facilitates analysis of gear mesh vibrat
11. tel 1 800 452 4844 tel 305 267 4245 fax 305 267 4286 Canada Australia tel 1 877 894 4414 tel 1 800 629 485 fax 905 206 4120 fax 61 3 9272 0749 Europe New Zealand tel 31 20 547 2323 tel 0 800 738 378 fax 31 20 547 2390 fax 64 4 495 8950 Japan Asia Pacific tel 81 426 56 7832 tel 852 3197 7777 fax 81 426 56 7840 fax 852 2506 9284 Product specifications and descriptions in this document subject to change without notice Copyright 1997 2000 Agilent Technologies Printed in U S A 5 00 5966 3063E ose Agilent Technologies Innovating the HP Way
12. HP GL Plotter and HP GL Printer Time Stamp GPIB Capabilities Listener Talker Direct control of plotters printers disk drives Conforms to IEEE 488 1 488 2 Conforms to SCPI 1992 Controller with Agilent Instrument Basic option Standard Data Format SDF Utilities Exchange data between virtually all Agilent Dynamic Signal Analyzers Easy data transfer to spreadsheets Data transfer to MATRIX and Matlab SDF utilities run in an external PC Calibration amp Memory Single or Automatic Calibration Built In Diagnostics amp Service Tests Nonvolatile Clock with Time Date Time Date Stamp on Plots and Saved Data Files Online Help Access to Topics via Keyboard or Index Fan On Off Agilent Technologies Test and Measurement Support Services and Assistance Agilent Technologies aims to maximize the value you receive while minimizing your risk and problems We strive to ensure that you get the test and measurement capabilities you paid for and obtain the support you need Our extensive support resources and services can help you choose the right Agilent products for your applications and apply them successfully Every instrument and system we sell has a global war ranty Support is available for at least five years beyond the production life of the product Two concepts underlie Agilent s overall support policy Our Promise and Your Advantage Our Promise Our Promise means your Agilent test and measurement equ
13. ML PORT PARALLE PORT on 1 Se ee EXT TRIG TACH AC POWER 100 240VAC 47 440Hz 350VA Max bes apes AETI Sex DC POWER 12 2 lc nominal 200va Max N O oS AC FUSE 100 240VAC normal blow 8A 250V J g DC FUE 12 28VDC normal blow 30A 32V WARNING gt For continued protection against fire hazard AC POWER B FUSE 4 POWER SELECT replace only ith the same type and rating of fuse as specified for the power selected CAUTION Np operator serviceable parts inside EXT fer servicing to qualified personne MONITOR WARNING Fok protection from electric shock hazard power cord ground must KEYBOARD not be defeated Q R50254C CE p K A oc AC a Sg i x 2 AC Power Universal power supply will oper ate with any combination of voltage between 100 and 240 VAC and line frequency between 47 and Power Select 440 Hz The External Trigger hornan Max Switch between maximum power a P 0nd sources without Sva S 9 dit ene ec conditioning hardware safc tii conaimoning a i required Reads VAA Wars SAAE frequency RPM on i Triggers on selected ealeetad lavels operation level between between 20 volts 10 volts Keyboard External Monitor Use a standard PC Drive a multisync keyboard to title data monitor for remote edit Agilent Instrument viewing by large BASIC programs groups or to operate the instrument Laboratory quality measurements in the field
14. Octave Analysis option 1D1 e Order Analysis option 1D0 e Swept Sine option 1D2 e Correlation Analysis e Histogram Analysis e Time Capture All measurement options may be retrofitted RPM Display Read RPM in any measurement mode Shown with option AY6 Add Two Channels DYNAMIC SIGNAL ANA YZER Inst Yode ORDER Meas From Online Help Applications oriented help is just a few keystrokes away Powerful Markers Extract information from measurement data with trace and special markers e Individual Trace e Coupled Trace e Absolute or Relative e Peak Search e Harmonic e Band e Sideband Power e Waterfall e Time Parameter e Frequency and Damping SS eee z Agile xt 35670A MARKER 2000 HOM HOM HONS ie Re 4 CH 1 ve o o Hait Input Channels e Analog A weighted Built In 3 5 inch Flexible Disk Drive Store instrument states programs time captured data water fall data trace data limits math functions data tables and curve fit synthesis tables Supported disk formats are HP LIF and MS DOS Internal RAM may also be formatted as storage disk ET EEC E S amp SS e Inst moge i j j N Math Functions Powerful math and data editing functions filters switchable Precision to quickly modify e Transducer sensitivity Measurements measurement results input e 16 bit ADC Curve fit and freq e Engineering units e 0 15 dB
15. RPM B TAH mgpk LinMag AHOrder MS DOS and Microsoft are U S registered trademarks of Microsoft Corp CH1 and CH2 Inputs SiGe ang Because order tracking is implement ed in the software data is more precise and your job is easier Compared to traditional analog order tracking techniques computed order tracking offers e Improved dynamic range at high orders e More accurate tracking of rapidly changing shaft speeds e Accurate RPM labeled spectra with exact RPM trigger arm e Wide 64 1 ratio of start to stop RPMs Order Map Use order maps for an overview of vibration data versus RPM or time Display the amplitude profile of indi vidual orders and suborders using the slice marker function Alternatively use trace markers to select individual traces for display a FFT S22 ANALYSIS RPM B KREM Trace 2 Order OCTAVE ANALYSIS Order Trace 3 45 CORRELATN ANALYSIS HISTOGRAM i TIME TIME CAFTUR 18Order SU The slice marker feature is used to select and display an order or suborder from an order map Order Tracking Measure only the data you need Order tracking lets you measure the amplitude profile of up to five orders plus composite power simultaneously on each channel Up to four orders or three orders and composite power can be displayed simultaneously Inst Hode ORDER Meas From CH1 Input MEASUREMENT COMPLETE RFM 8 IACH Ord 1 66 1f m
16. Top Force Exponential Math Conjugate Magnitude Real and Imaginary Square Root FFT FFT LN EXP i or j PSD Differentiation A B and C weighting Integration Constants K1thru K5 Functions F1 thru F5 Analysis Limit Test with Pass Fail Data Table with Tabular Readout Data Editing Time Capture Functions Capture transient events for repeated analysis in FFT octave order histogram or correlation modes except swept sine Time captured data may be saved to internal or external disk or transferred over GPIB Zoom on captured data for detailed narrowband analysis Up to 750K samples of data can be saved in the standard unit Data Storage Functions Built in 3 5 in 1 44 Mbyte flexible disk also supports 720 KByte disks and 128 Kbyte NVRAM disk Both MS DOS and HP LIF formats are available Data can be formatted as either ASCII or Binary SDF The 35670A provides storage and recall from the internal disk internal RAM disk internal NVRAM disk or external GPIB disk for any of the following information Trace Data Limit Data Agilent Instrument BASIC Programs Curve Fit Synthesis Instrument Setup States User Math Time Capture Buffers Waterfall Display Data Data Tables Tables Interfaces GPIB IEEE 488 1 and 488 2 Parallel RS 232C Serial Hard Copy Output To Serial or Parallel HP GL Plotters To Raster Printers To Serial or Parallel HP GL Printers To Disk File Supports Raster Printer
17. arkers Frequency Response Markers 15 Signal Averaging FFT Mode Average Types 1 to 9 999 999 avgerages RMS Time Exponential RMS Exponential Peak Hold Time Averaging Controls Overload Reject Fast Averaging On Off Update Rate Select Select Overlap Process Percentage Preview Time Record Measurement Control Start Measurement Pause Continue Measurement Triggering Continuous Freerun External Analog or TTL Level Internal Trigger from any Channel Source Synchronized Trigger GPIB Trigger Armed Triggers Automatic Manual RPM Step Time Step Pre and Post Trigger Measurement Delay Tachometer Input 4V or 20V range 40 mV or 200 mV resolution Up to 2048 pulses rev Tach hold off control Source Outputs Random Burst Random Periodic Chirp Burst Chirp Pink Noise Fixed Sine Note Some source types are not available for use in optional modes See option description for details Input Channels Manual Range Up Only Auto Range Up Down Auto Range Anti alias Filters On Off AC or DC Coupling LED Half Range and Overload Indicators Floating or Grounded A Weight Filters On Off Transducer Power Supplies 4 ma constant current Frequency 20 Spans from 195 mHz to 102 4 kHz 1 channel mode 20 Spans from 98 mHz to 51 2 kHz 2 channel mode Digital zoom with 244 mHz resolution throughout the 102 4 kHz frequency bands Resolution 100 200 400 800 and 1600 lines Windows Hann Uniform Flat
18. e Inputs MEASUREMENT PAUSED fe Freg Resp Hi z Yi ee 7 _ug OCTAVE ANALYSIS i ORDER ae LogMag f ANALYSIS Characteristics of a eae J TE selected resonance Er are automatically calculated from an a cet mA Damp 3 591 e 3 ANALYSIS impact measurement eee using the frequency Waste and damping marker Kil al2 Markers A frequency and damping marker provides the resonant frequency and the damping ratio of single degree of freedom frequency response measurements Gain and phase margin markers extract key frequency domain stabili ty data from frequency response measurements of control systems Signal Injection for Control Loops Use one of three Agilent signal injection devices for testing control loops The 35280A summing junction provides convenient dc to 1 MHz sig nal injection for most control loops Use the 35281A clip on transformer when it is not possible to temporarily open the loop or use the 35282A signal injection transformer when secondary voltages are up to 600 Vpk Time Capture Capture transient events or time histories for complete analysis in any measurement mode except swept sine Use either the entire time capture record or a Selected region of interest for repetitive analysis in the FFT octave order track correlation or histogram instrument modes Add an additional 4 Mbytes option AN2 or 8 Mbytes option UFC of memory for really deep time capture capability
19. ectral Density Time Domain oscilloscope mode Time Waveform Autocorrelation Cross Correlation Orbit Diagram Amplitude Domain Histogram PDF CDF Trace Coordinates Linear Magnitude Log Magnitude dB Magnitude Unwrapped Phase Real Part Imaginary Part Group Delay Nyquist Diagram Phase Polar Trace Units Y axis Amplitude combinations of units unit value calculated value and unit format describe y axis amplitude Units volts g meters sec2 inches sec2 meters sec inches sec meters mils inches pascals Kg N dyn lb user defined EUs Unit Value rms peak peak to peak Calculated Value V V2 V2 Hz V V Hz V2s Hz ESD Unit Format inear dB s with user selectable dB reference dBm with user selectable impedance Y Axis Phase degrees radians X Axis hz cpm order seconds user defined Display Formats Single Quad Dual Upper Lower Traces Small Upper and Large Lower Front Back Overlay Traces Measurement State Bode Diagram Waterfall Display with Skew 45 to 45 Degrees Trace Grids On Off Display Blanking Screen Saver Display Scaling Autoscale Selectable Reference Manual Scale Linear or Log X Axis Input Range Tracking Y Axis Log X amp Y Scale Markers with Expand and Scroll Marker Functions Individual Trace Markers Coupled Multi Trace Markers Absolute or Relative Marker Peak Search Harmonic Markers Band Marker Sideband Power Markers Waterfall Markers Time Parameter M
20. er LOU rans with Graphics control Mass storage other instruments and peripherals a Graphics plotting Event initiated e Enhance functionality by creating branching Graphics axes custom measurements and labeling Clock and calendar e Increase productivity with Program control General device 1 0 automated operation Array operations Agilent Instrument BASIC is a compatible subset of the Agilent BASIC used in HP 9000 series 200 ASSIGN Hp35 70a TO saa es 1 2z OUTPUT amp am SYST FRES 300 400 and 700 computers 3 OUTPUT H INST ORD l 4 OUTPUT Hp2 gt VOLT1 RANG UNIT USER SFAC 2 V INSERT 5 OUTPUT MOLTL RANG Ub uo AB IC SPACE 6 OUTPUT amp CALCL UNIT AMF A Easy Programming Keystroke recording ganna aa nCALCT UNIT VOLT YW INSERT a pee 9 OUTPUT ARM RPM INCR AB rpm L LNE d A OUTPUT amp TRIG TACH RANG G The Agilent Instrument BASIC Mio Coro Dt your OUTPUT GHp gt TRIG TACH LEV 18 0393700787 DELETE a uy Pie i Agilent Instrument BASIC program OUTFUT amp Hp35676a TRIG TACH SLOP G LINE BED program editor supports RECALL e Line by line syntax checking LINE gh cas DELETE e Pre run program verification CHARACTER e Single step and debug e Automatic line numbering An optional PC style 101 key key board facilitates program develop ment and editing Simple programs can be entered or edited using the Inst Hode FFT front panel keys Large pro
21. er and Linear Spectrums Match your spectrum measurement mode to the signal being tested Use linear spectrum analysis to measure both the amplitude and phase of periodic signals such as the spectra of rotating machinery Power spectrum analysis is provided for averaging nonrepetitive signals OCTAVE ANALYSIS Ti ORDER ANALYSIS Two spectrums of road induced vibration meas ured at different speeds are compared using the front back mode of the Agilent 35670A SWEPT SINE CORRELATN ANALYSIS Averaging Various averaging modes let you fur ther refine spectrum analysis meas urements Time averaging extracts repetitive signals out of the noise while rms averaging reduces the noise to its mean value Exponential averaging available for both time and rms averaging is useful for reducing the noise while following changing signals tracking the resonance shifts in a fatiguing structure for example Time Domain Use your spectrum analyzer as a low frequency oscilloscope or view signals in the time and frequency domains simultaneously Note anti alias filters can be switched off Special markers for time domain data facilitate extraction of key control system performance parameters overshoot rise time setting time and delay time Data Table Use a tabular format to keep track of key frequencies in the spectra of rotating machinery The amplitude and frequency of the signal and a 16 character entry
22. grams can Meas From CH1 and CH2 Inputs be developed or edited in HP 9000 MEASUREMENT PAUSED Ab 2 of 4 a Series 200 300 and 400 computers it sue Co eee IAAT ANALYSIS or on a HP Vectra with Instrument AT ORDER BASIC for Windows E2200A and C E then transfered to the 35670A wo SINE SINE CORRELATN lt ANALYSIS i HISTOGRAM TE Agilent Instrument BASIC can be used to display measurement results in a new format or Sa TERE to create a new Pump RPM operator interface 12 Add Two Channels Option AY6 51 2 kHz Frequency Range On One and Two Channels 25 6 kHz Frequency Range On Four Channels One or Two Reference Channels Enhance your productivity by adding two additional input channels to your portable analyzer Having four channels often means the difference between solving a problem in the field and having to schedule time in a test bay Monitor four signals simultaneously or use channel one as the reference channel for up to three simultaneous cross channel measurements Two totally independent cross channel measurements are made by selecting channels one and three as indepen dent reference channels All channels are sampled simultaneously Use triaxial measurements to simulta neously characterize the motion of mechanical devices in three axes For control systems simultaneously measure several points in a single loop Curve Fit and Synthesis Option 1D3 20 Poles 20 Zeros Curve Fi
23. ilf Laghiag OCTAVE ANALYSIS mmi lpk KRPM CHI Ord z Be LaF milpkp Inst Node ORDER Meas From MEASUREMENT PAUSED mr bit2 ll aioe mil Time Real gal rr l fi d j WW Oscilloscope quality orbit diagrams mean you carry only one instrument onto the shop floor CHi and CH2 Inputs FFT ANALYSIS RPM 937 OCTAVE ANALYSIS SINE CORRELATN ANALYSIS aTOGRAM Timel Orbits Obtain oscilloscope quality orbit measurements with your 35670A Unlike traditional FFT analyzers the 35670A equipped with computed order tracking displays a selected LogMag number of loops usually one as the shaft RPM is varied mmilpk ANALYSIS TOGRAM TIME 1k BACHI Ord 1 i LogMag 14 1KRPI CHL Ord 18 Be Laer mmi 1p Loaghag 1A Order tracking is used to simultaneously display up to four orders ora combination of orders Inst Hode FFT Meas From CHL and CHZ Inputs MEASUREMENT RUNNING ACI Order MA 255 58 me Pi 2355 2 422 OCTAVE composite power and m a T E S ANALYSIS nilpk a Poe 3 RPM profile a ORDER ANALYSIS a SWEPT Imag J Hid SINE m F al ar a RPM Profile Bees mid e ae ee RELL ERRER TR ee ee SE Nicestics Use RPM profile to monitor the variation of RPM with time during order tracking measurements 5 TOGRAM Composite Power Composite power provides the total signal power in a selected channel as a function of RPM a4
24. ion HEFT SINE CORRELATN ANALYSIS HISTOGRAM f TIME TIME CAPTURE Markers Markers streamline analysis by helping you select and display specif ic data Marker functions include marker to peak next right peak and coupled markers for selecting points in multiple data displays Markers readouts are absolute or relative to your selected reference Special Markers Three special marker functions facilitate analysis of your spectral data Sideband markers aid analysis of modulation signals Use this func tion to quickly locate sidebands in the complicated spectra of rotating machines A band power marker reads the total power in a selected band of frequencies and a total har monic distortion marker lets you calculate total harmonic distortion without including the effects of noise and CH2 Inputs RFM amp C nz i Pipes o TRE i i i LURERE ORDER PANALYSI5 IHEP T SINE ELATH CORR ANALYSIS HISTOGRAM TIME Frequency Response Measurements The 35670A has the flexibility Inst Mode FFT Meas From CH1 and CH2 Inputs to make measurements of both iE C electrical networks and mechanical AFL FRESZI K3 W 2 688__k deg OCTAVE devices FFT based network analysis MNRE YIG is fast enough to allow real time ad Gmie aeisi T A justments of circuit parameters while f r go no go testing a es 3 i ae the swept sine option provides exact in production The T sie ZKH SINE A o
25. ipment will meet its advertised performance and functionality When you are choosing new equipment we will help you with product information including realistic perform ance specifications and practical recommenda tions from experienced test engineers When you use Agilent equipment we can verify that it works properly help with product operation and provide basic measurement assistance for the use of specified capabilities at no extra cost upon request Many self help tools are available Your Advantage Your Advantage means that Agilent offers a wide range of additional expert test and measurement services which you can purchase according to your unique technical and business needs Solve problems efficiently and gain a competitive edge by contracting with us for calibration extra cost upgrades out of warranty repairs and on site education and training as well as design system integration project management and other professional engineering services Experienced Agilent engineers and technicians worldwide can help you maximize your productivity optimize the return on investment of your Agilent instruments and systems and obtain dependable measurement accuracy for the life of those products For More Assistance with Your Test amp Measurement Needs go to www agilent com find assist Or contact the test and measurement experts at Agilent Technologies During normal business hours United States Latin America
26. onvolatile RAM PC style Keyboard German Keyboard Spanish Keyboard French Keyboard UK Keyboards Italian Keyboard Swedish Keyboard Rack Mount Without Handles Software Bundle 1D0 1D4 UFC Carrying Case for shipping Additional Manual Set Additional Agilent Instrument BASIC Manual Set Add Service Manual Military Calibration meets MIL 45662A Two Year Extended Service Contract To Upgrade Your 35670A To add an option to your 35670A order 35670U followed by the option number Options AY6 AN2 UFC and UFF must be installed by Agilent Technologies Option UE2 is available to upgrade instrument firmware to latest version as appropriate Accessories DC Power Cables The 35250A is a three meter cable terminated with lugs for connecting to most dc power sources The 35251A is a three meter cable terminated with an adaptor that plugs into a cigarette lighter For Testing Control Systems The 35280A summing junction provides convenient dc to 1 MHz signal injection for most control loops Use the 35281A clip on transformer when it is not possi ble to temporarily open the loop or use the 35282A signal injection transformer when secondary voltages are up to 600 Vpk Summary of Features on Standard Instrument Instrument Modes FFT Analysis Correlation Analysis Histogram Time Time Capture Measurement Frequency Domain Frequency Response Power Spectrum Linear Spectrum Coherence Cross Spectrum Power Sp
27. se thereby limiting the dynamic range Inst Hode SINE Meas From CH1 and CH2 Inputs SWEEP COMPLETE AON TROL LOOP A dB Mag if dB i fi i pljes a Phase EEE Characterize Nonlinear Networks Use the auto level feature to hold the input or output amplitude constant during a sweep This provides the device response for a specific signal amplitude With FFT based network analysis using random noise the ran dom amplitudes of the stimulus tend to average out the non linearities and therefore does not capture the dependency of the response on the stimulus amplitude Logarithmic Sweep Test devices over more than six decades of frequency range using logarithmic sweep In this mode the frequency is automatically adjusted to provide the same resolution over each decade of frequency range With FFT network analysis resolu tion is constant not a problem when measuring over narrow frequency ranges Flexible Make the measurement your way Independently select logarithmic or linear sweep sweep up or down automatic or manual sweep and autoresolution OCTAVE ANALYSIS ORDER ANALYSIS The stability of a control loop is quickly character ized using the gain and phase margin marker function CORRELATN ANALYSIS 20 1KHz HISTOGRAM PTE CAPTURE Automatic Frequency Resolution Use autoresolution to obtain the fastest sweep possible without sacri ficing accuracy With au
28. se exceptional circumstances use 1 3 octave resolu tion at frequencies up to 40 kHz ona single channel Resolutions of 1 1 and 1 12 octave are also available Inst hode OCTAVE Meas From CH1 Input MEASUREMENT PAUSED BAL AL Pur Spec Ai A 75 i dESPLrms dBSPLrins This waterfall Inst Hode OCTAVE display of a flyover Meas From MEASUREMENT PAUSED A D OVER Ha test can be analyzed trace by trace or by selecting time slices along the z axis c ao 126 mia dBSPLrms dB Mag Overall sound pressure level and A weighted sound pressure level can be displayed with the octave bands individually together or not at all A fan off mode lets you use the instrument in the sound field being measured ANSI 1 11 1986 All octave filters comply with filter shape standards ANSI 1 11 1986 Order 3 type 1 D DIN 45651 and IEC 225 1966 An 80 dB dynamic range for the audio spectrum pro vides the performance required by acousticians Switchable analog A weighting filters in the input chan nels comply fully with both ANSI 1 4 1983 and IEC 651 1979 Type 0 Ali 2 CHE Yi F 4454 ORDER FANALYSIS SWEPT PEE J CORRELATN HANALYS1 HISTOGRAM of TIME Real time CHANNELS g 7am 1 3 octave measurements at frequencies up to 40 kHz TIME CAPTURE 48k Hz CHL and CH2 Inputs AH i 2 i ORDER ANALYSIS Truca LG CORRELATN ANALYSIS HISTOGRAM oy TIME TIME CAPTURE
29. spectrum Uency response g m s2 m s m in s2 in s in mil kg dyn Ib N and pascals e Built in 4 mA constant current power supply Large 6 9 inch 17 5 cm display Display area is not compromised by portability synthesis available ampltude accuracy ith option 1D3 0 04 dB 0 5 degrees channel match full scale e 90 dB dynamic range typical e 130 dB dynamic range with swept sine option 1D2 e Up Down autorange e Up only autorange GPIB Connector Integrate the 35670A with other Low Noise Fan Source Types instruments and e Random Noise peripherals for eee e Burst Random system operation DC Power applications Noise or printing plotting Accepts 12 to 28 volts Binning speed e Periodic Chirp System controller dc nominal Use the depends on e Burst Chirp for GPIB IEEE 488 1 35250A power cable ambient e Pink Noise and 488 2 compati for DC power source temperature e Fixed Sine ble instrumentation connection or the p e Arbitrary via Agilent 35251A power cable Waveform Instrument BASIC Serial Port with cigarett lighter Source option 1C2 Plot to HP GL Parallel Port adapter Option 1D4 Provides direct plotters or printto Plot to HP GL plotters e Swept Sine control of GPIB HP GL and raster or print to HP GL and Source printers plotters printers raster printers Option 1D2 it HP SS80 disk Note The source Is located on the front panel of a standard two channel 35670A SER
30. surement capabil ity or enhance all measurement modes Accuracy Channel Match Real time Bandwidth Resolution Key Specifications Frequency Range Dynamic Range Time Capture Source Types AY6 1D0 1D1 UK4 1D2 1D3 1D4 1C2 UFF AN2 UFC 100 Versatile two or four channel high performance FFT based spectrum network analyzer 102 4 kHz 1 channel 51 2 kHz 2 channel 25 6 kHz 4 channel 90 dB typical 0 15 dB 0 04 dB and 0 5 degrees 25 6 kHz 1 channel 100 200 400 amp 800 lines 0 8 to 5 Msamples option UFC Random Burst random Periodic chirp Burst chirp Pink noise Sine Swept Sine option1D2 Arbitrary option 1D4 Add Two Channels Four Total Computed Order Tracking Real Time Octave Measurements Microphone Adapter and Power Supply Swept Sine Measurements Curve Fit and Synthesis Arbitrary Waveform Source Agilent Instrument BASIC Add 1 Mbyte NVRAM Add 4 Mbyte RAM 8 Mbytes Total Add 8 Mbyte RAM 12 Mbytes Total 1D0 1D4 UFC bundle 3 Agilent Technologies Innovating the HP Way Agilent 35670A Dynamic Signal Analyzer Agilent Instrument BASIC Option 1C2 Develop a custom user interface integrate several instruments and peripherals into a system using the 35670A as the system controller or simply automate measurements Versatile Measurement Modes Standard and optional measurement modes include e FFT Analysis e Real Time
31. toresolution the 35670A automatically adjusts the frequency step according to the device response High rates of ampli tude and phase change are matched with small frequency steps Low rate of change regions are quickly measured with larger frequency steps Test Multiple Devices Simultaneously Increase throughput in production Swept sine measurements up to 25 6 kHz can be made on three devices simultaneously using swept sine on a four channel 35670A Channel one is the common reference channel for these measurements Alternatively channels one and three can be designated as indepen dent reference channels for two totally independent swept sine measurements 11 Agilent Instrument BASIC Option 1C2 Realize the advantages of using your Over 200 Agilent Instrument Keystroke Recording instrument with a computer without BASIC Commands sacrificing portability Agilent Most program development begins Instrument BASIC provides the Program entry Binary functions een ieee aia mae power of a computer inside your and editing Tri tri PP Pa a a a 35670A MAJONOMSALG program instruction as you set up Program debugging operations your measurement using the front e Create custom interfaces for Memory allocation String operations panel The recorded sequence can be simplified operation Relation operators Logical operators used as the core of a sophisticated e Use the 35670A as a system General math GPIB control a TU AS ARLOTT ARIG controll
32. tter Frequency Response Synthesis Pole Zero Pole Residue and Polynomial Format Use curve fit and synthesis in the 35670A to take the guesswork out of your design process The 20 pole and 20 zero multiple degree of freedom curve fitter calculates a mathematical model of your system or circuit from measured frequency response data The model can be expressed in pole zero pole residue or polynomial format Analysis Strt Trace Aj Maximum Poles Stop Trace Aj Maximum zeros SHEEP COMPLETE TIME DELAY B 5 FREQUENCY SCALE 1 GAIN 8 623656 Curve fit provides an exact mathematical model of your circuit or device Transfer the circuit model to the synthesis function to experiment with design modifications Add and delete poles and zeros change gain factors time delays or frequency scaling then synthesize the frequency response from the modified model Design modifications are tested with out ever touching a soldering iron _ START FIT ABORT FIT CURVE FIT REGISTER EDIT TABLE COPY FROM SYNTHESIS FIT REGION CURVE FIT SETUP 13 Arbitrary Waveform Add 8 Mbytes RAM Option UFC Source Option 1D4 Add 4 Mbytes RAM Option AN2 Expand the data storage and Expand the data storage and time time capture capacity of your capture capacity of your 35670A PODLA Number of Spectra Stored Per Channel P EEGUENEY ON TME DNO very Standard Add 4 Mbyte Add 8 Mbyte Data man FFT
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