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Agilent E4991A RF Impedance/ Material Analyzer

1. 16190B performance kit 16195B 7 mm coaxial calibration kit 16092A SMD test fixture up to 500 MHz 16200B external DC bias adapter up to 1 GHz 82357A USB GPIB Interface for Windows 1 Test fixtures a keyboard a mouse USB GPIB Interface and a printed manual are not furnished as standard 2 Printed manual is not furnished as standard 3 Additional accessory details can be found in the Accessories Selection Guide for Impedance Measurements publication number 5965 4792E 4 Must specify one of language options ABA or ABJ for operation manual for shipment with product 5 Magnify lens and tweezers are not furnished as standard Must specify one of language options ABA or ABJ for operation manual for shipment with product 6 Short bar set magnify lens and tweezers are not furnished as standard 7 The USB GPIB Interface is required to control external devices Key Web Resources Please visit our component manufacturer industry area at www agilent com find component_test Please visit our impedance solutions area at www agilent com find impedance nas Agilent Email Updates www agilent com find emailupdates Get the latest information on the products and applications you select Windows is a U S registered trademark of Microsoft Corporation Visual Basic for Applications is a U S registered trademark of Microsoft Corporation Bluetooth is a trademark owned by the Bluetooth SIG Inc For Cas
2. Agilent E4991A RF impedance material analyzer includes Impedance test head calibration kit 50 Q load open short low loss capacitor torque wrench power cable CD ROM firmware VBA software and CD ROM manual Configuration guide Choose the option from the group lt A gt depending on your require ment for frequency reference function Then choose the appro priate options from the option group lt B gt lt C gt lt D gt and lt E gt O Choose ONE and ONLY one Options are mutually exclusive Q Choose any combination lt A gt For frequency reference function O E4991A 800 standard frequency reference no DC bias O E4991A 1D5 high stability frequency reference lt B gt For test function Q E4991A 001 DC bias Q E4991A 002 material measurement firmware Q E4991A 007 temperature characteristic test kit Q E4991A 010 probe station connection kit lt C gt For calibration certificate LY E4991A 1A7 ISO 17025 compliant calibration lt D gt For accessories Q E4991A 810 keyboard Q E4991A 820 mouse Q E4991A 1CM rackmount kit Q E4991A 1CN front handle kit Q E4991A 1CP handle rack mount kit lt E gt For manual2 Q E4991A ABA U S English localization Q E4991 A ABJ Japan Japanese localization Q E4991A OBW service manual Accessories 16197A4 bottom electrode SMD test fixture up to 3 GHz Options 16197A 001 add 0201 Cinch 0603 mm device guide set 16197A ABA U S English loc
3. application examples Passive components e RF impedance measurement of chip components such as ceramic capacitors RF inductors ferrite beads and resistors Semiconductors e Capacitance Voltage C V characteristics and Equivalent Series Resistance ESR measurements of varactor diodes Materials e Permittivity and loss tangent evaluation of plastics ceramics printed circuit boards and other dielectric material e Permeability and loss tangent evaluation of ferrite amorphous and other magnetic materials E4991A Provides New Insights into RF Passive Component Behavior The Agilent E4991A s enhanced frequency coverage up to 3 GHz is compatible with wireless communication applications such as W CDMA Bluetooth and Wireless LAN The E4991A s wide impedance coverage and versatile measurement functions allow analysis of RF chip inductors and capacitors under actual operating conditions A wide range of test fixturing solutions makes tiny chip device measurements even easier Quality Factor Q and Equivalent Series Resistance ESR are critical parameters for the components used in mobile communication equipment Q and ESR measurements require high accuracy Prior to the E4991A there was not a good solution available over 2 GHz The E4991A offers much improved Q and ESR accuracy over traditional network analyzers due to the enhanced RF I V technique that measures voltage and current at the device under t
4. Figure 8 Agilent 16197A bottom electrode SMD test fixture Model 16196A 16196B 16196C 16196D Device size supported 0603 inch 1608 mm 0402 inch 1005 mm 0201 inch 0603 mm 01005 inch 0402 mm Figure 9 Agilent 16196B parallel electrode SMD test fixture Connectivity Advances with PC and Windows based Technology Visual Basic for applications VBA helps automate tasks The built in VBA is available for customization and automation of complex measurement procedures You can create macro programs in the Integrated Development Environment IDE of VBA ina similar manner to Visual Basic operation Link to EDA tools Using electronic design applications such as Agilent s Advanced Design System ADS in conjunction with the E4991A can help you optimize and verify the performance of your device with simulated circuit modeling You can easily store measured data in CITIFILE format and import to EDA software tools Agilent s ADS software may be purchased separately from the E499 1A LAN interface enables seamless connectivity with PC environment Using the remote user interface software provided with the E4991A you can easily correct data and troubleshoot over the LAN interface The remote user interface brings the instrument control panel to the PC display via LAN You can gain control of instruments in physically separate locations Easily share your measurement data with other application
5. X G B C L parameters R D 0 1 Sweep e Frequency parameter e Test signal level setting DC bias voltage e DC bias current Fixturing e Selection from various Agilent test fixtures e Built in fixture compensation function Accuracy enhancement Impedance e Accurate high Q device measurement measurement due to low loss accuracy capacitor calibration e Accurate measurement over non 50 Q impedance Other Equivalent circuit analysis function In depth Device Characterization Ri E4991A E4991A State File1 Boa x WE Fic Edt View Stis Sweep Meas Foenal Math Scale Myke Window Cal System Hep 16 xj tr 707 945784384 Miz Intuitive graphical user interface The 8 4 inch color LCD with Windows based GUI brings an intuitive view of measurement settings and results The E4991A s i can display up to 3 scalar wE iph ar alt and 2 complex parameters Ee TMZ SI simultaneously E e UE ANHE FADIA ECNI Siate Fas x 0 Bias OFF Calf Cmpn ON lOe13 Figure 2 shows a measurement result of a chip bead You can observe the Z R and X parame ters on the display at same time You can also assign each measure ment trace in a separate window Windows styled GUI brings the added benefits of mouse operation Read OEF Cafe Cron ON to the E4991A Simply drag the Figure 2 Flexible measurement trace assignment mouse over the area you are interested in and you can zoom in quickly and easily See Figure 3 un x T
6. 8 mm Inner diameter 3 1 mm Thickness lt 3 mm Large size Outer diameter lt 20 mm Inner diameter 5 mm Thickness lt 8 5 mm Figure 15 16454A Magnetic material fixture Accurate impedance measurement with probe station Figure 16 Agilent E4991A with probe station More ICs or circuit modules are used in electronic circuits to save spaces more capacitors or inductors such as thin dielectric layers and pattern inductors tend to be developed on wafer or substrate These devices usually have a small capacitance or inductance like pF nH The Agilent E4991A RF impedance material analyzer with Option E4991A 010 probe station connection kit offers an accurate on wafer or micro component impedance measurement solution up to 3 GHz 3 5 mm to 7 mm Test head adapter y d hey g N Ole k CA m Semi rigid cable Probe head Stage 4991A lt lt Extension cable Mounting plate Comes with Agilent E4991A Option E4991A 010 probe station connection kit Figure 17 Probe measurement configuration using E4991A Option E4991A 010 Easy installation When connecting the E4991A to probe stations the accuracy degradation caused by port extension and improper calibra tion always becomes a big issue The Option E4991A 010 probe station connection kit for E4991A provides all necessary parts as one option and solves this problem This option includes a smaller test head extension cables
7. A tools to improve modeling accuracy E4991A E4991A State Filet Figure 4 shows the C V characteristic measurement of a varactor diode Sweeping DC voltage from 0 5 V to 4 5 V you can easily read capacitance change 11 27 pF using the delta marker function Evaluate DC bias voltage dependency on components easily DC current bias measurement is also avail able so that you can evaluate characteristics of inductors such as saturation or hysteresis Ready Bss ON CaF iCrenON Del 13 Figure 4 Varactor diode capacitance vs DC voltage characteristics Figure 5 16200B DC bias adapter connected to the E4991A SS Figure 5 1 16200B Trace 1 E4991A RF Impedance Material Analyzer E4991A State Filet e x ZS Fie Edit View Stimulus Sweep Meas Format Math Scale Marker Window Cal System Help 18 xj Select Circuit l1 Z 2 _ z il ee neers Ready Bias OFF CalFix CmpnON Del13 Avg OFF Figure 6 Equivalent circuit analysis models Increase Productivity with Segment Sweep Function The segment sweep function enables different measurement setups in a single sweep by dividing the sweep range into segments Each segment including the frequency range number of points averaging factor DC bias level V or I and test signal level can be set independently See Figure 7 Segment sweep function can drastically reduce your test time when you need specific data in a wide frequency r
8. Agilent E4991A RF Impedance Material Analyzer Technical Overview The new standard in RF impedance and material measurements Bee Agilent Technologies E4991A RF Impedance Material Analyzer Windows based user interface e Windows based graphical user interface GUI brings an intuitive view of measurement settings and results e 8 4 inch TFT color LCD can display up to 5 traces 3 scalar and 2 complex parameters 9 markers 1 reference marker and 8 markers and 801 sweep points Data storage function e Internal 31 2 inch floppy disk drive and hard disk drive are available e Store VBA program calibration data and measurement data e CITIFILE format is supported for automation tool users LAN interface Parallel interface j Support parallel interface printers Control other instruments or simplify e test data sharing e Connect to a PC through remote user interface software Versatile analysis functions e Marker analysis and marker limit functions reduce test time Various test signals such as frequency DC bias and AC signal level are available Equivalent circuit analysis function enables easy modeling of components with 5 different multi parameter models Built in Visual Basic for Applications VBA programming function e VBA offers easy programming for automation and further detailed analysis High accuracy and adaptability e Test head with 7 mm connector
9. adapters a connecting plate and detailed installation procedures Probe stations are provided from Cascade Microtech Inc With this kit you can easily establish a reliable measurement system in the short time Impedance measurement specification at the extended test head port The E4991A s Option E4991A 010 has a guaranteed impedance measurement specification at the end of the extended 7 mm test head port This is an impor tant element for accurate mea surement because the port extension usually de grades the measurement accuracy The situa tion becomes even worse if the cable used has an improper characteristic Agilent solved this issue by preparing reliable extension cables and making a special test head This test head is small enough to be brought closer to probe stations so that the measurement error caused by this extra length is also minimized Probe Probe head Figure 18 Agilent E4991A Option E4991A 010 probe station connection kit Wide and repeatable impedance measurement Agilent E4991A can cover wider impedance range than network analyzers In general network analyzers are good at measuring impedance near 50 Q but the accuracy gets worse for impedance away from 50 Q The E4991A is designed to measure non 50 Q impedance as well so it can give much better accuracy especially when you measure small capacitance and inductance like 1 pF and 1 nH The E4991A is repeatable over time and temperat
10. adapts easily to various test fixtures RF I V technique enables highly accurate measurements up to 3 GHz GPIB interface e Controlled by external PC cannot control external instruments External keyboard and mouse interface e VBA programming made easy e Users can perform operations with a mouse for more comfortable operation USB interface Control external instruments using the e Display measurement results on a 82357A USB GPIB interface larger VGA monitor Support USB interface printers External VGA output Powertul Analysis Functions to Meet Your Needs The Agilent E4991A RF impedance material analyzer provides a total solution for making highly accurate repeatable and stable measurements of surface mount devices SMD and dielectric magnetic materials Recent trends indicate that wireless communications and digital equipment operating frequencies are getting higher while component sizes are getting smaller Component and equipment manufacturing engineers need to evaluate components they will be using in their products under their projected operating conditions The E4991A can evaluate passive component s characteristics up to 3 GHz Additionally engineers must measure SMDs as small as 0201 inch 0603 mm Key Specifications Table 1 E4991A key specifications E4991A RF Impedance Material Analyzer Operating frequency Impedance parameters Material parame
11. alization 16197A ABJ Japan Japanese localization 16196A B C D gt parallel electrode SMD test fixture up to 3 GHz Options 16196A B C D 710 add magnifying lens and tweezers 16196A B C D ABJ Japan Japanese localization 16196A B C D ABA U S English localization 16196U maintenance kits for 16196X Options 16196U 010 upper electrode set for 16196A B C 5 ea 16196U 020 upper electrode set for 16196D 5 ea 16196U 100 1608 mm short plate set 5 ea 16196U 110 1608 mm lower electrode set 5 ea 16196U 200 1005 mm short plate set 5 ea 16196U 210 1005 mm lower electrode set 5 ea 16196U 300 0603 mm short plate set 5 ea 16196U 310 0603 mm lower electrode set 5 ea 16196U 400 0402 mm short plate set 5 ea 16196U 410 0402 mm lower electrode set 5 ea 16191A bottom electrode SMD test fixture DC to 2 GHz Options 16191A 701 short bars set lx 1x2 4 16x 24x 2 32 X2 4x24 45x24x24 mm 16191A 710 add magnifying lens and tweezers 16191A 010 EIA EIAJ industry sized short bar set 16192A parallel electrode SMD test fixture DC to 2 GHz Options 16192A 701 short bars set lx 1x 2 4 16x24 x 2 3 2 X 2 4 X 2 4 4 5 x 2 4 x 24 mm 16192A 710 add magnifying lens and tweezers 16192A 010 EIA EIAJ industry sized short bar set 16094A probe test fixture up to 125 MHz 16453A dielectric material test fixture up to 1 GHz 16454A magnetic material test fixture up to 1 GHz
12. ange With segment sweep you can avoid repeatedly changing instrument setups See Figure 7 1 Various Text Fixtures are Ready to Use The 16197A and 16196A B C D are test fixtures that accommodate passive surface mount devices SMD and have high repeatability and stable frequency characteris tics up to 3 GHz The 16197A is a test fixture that can hold chip devices that have electrodes at the bottom Various sizes and shapes of devices are supported The 16197A supports the following EIA EIAJ standard sizes 0201 CGinch 0603 mm 0402 inch 1005 mm 0603 inch 1608 mm 0805 inch 2012 mm 1208 Gnch 3216 mm 1210 Gnch 3225 mm Non standard shape requires modification of the holder part 1 Option E4991A 001 is required dir 500 M 100 1 10 000 1 46 40 10 000 1 9 G 100 16 5 0000 2G 80 16 5 0000 Bias OFF CalOFF Cmon OFF Ready Figure 7 Segment list table 40 2 G Hz Biss OFF C3 0FF Cmon OFF I Awor T Figure 7 1 Segment sweep measurement example The 16196A B C D series are coaxial structured high perfor mance test fixtures which achieve high repeatability and stability e up to 3 GHz The 16196x series simplifies operation significantly and eliminates operation related p errors The 16196x series supports ap chip devices as small as 01005 inch 0402 mm size Each test fixture model supports respectively shaped devices as follows
13. aterial parameters such as permeability and permittivity up to 1 GHz The dielectric material test fixture 16453A and the magnetic material test fixture 16454A eliminate designing time consuming custom test fixtures Dielectric material testing The 16453A employs the parallel plate method for dielectric constant and loss tangent measurements up to 1 GHz It is well suited for measuring a sheet of solid substrate material such as PC board ceramic or polymer Simple measurements are possible by inserting the material between the electrodes With E4991A Option E4991A 002 material measurement function you can display permittivity parameters directly on the ana lyzer s display Magnetic material testing The 16454A is used for perme ability measurements up to 1 GHz on the E4991A This single wound coil structured test fixture holds toroidal shaped magnetic materials such as soft ferrite and magnetic cores It is possible to accommodate different sizes of toroidal cores by exchanging small smaller than 8 mm diameter and large adapters To use the 16454A you need the material measurement function Option E4991A 002 VAI Zv Figure 13 E4991A with material test fixtures Material size requirements Diameter 15 mm Thickness lt 3 mm he Agilent 16453 DIELECTp ic EST FIXTURE TERIAL Figure 14 16453A Dielectric material fixture Material size requirements Small size Outer diameter lt
14. cade Microtech products contact Cascade Microtech Inc Cascade Microtech 2430 NW 206th Avenue Beaverton Oregon 9 006 U S A Tel 503 610 1000 Fax 506 601 1002 Email sales cmicro com Wwww cascademicrotech com For the ESPEC products contact ESPEC Corp ESPEC CORP 3 5 6 Tenjinbashi Kita ku Osaka 530 8550 Japan Tel 81 6 6358 4741 Fax 81 6 6358 5500 www espec co jp ESPEC North America Inc 425 Gordon Industrial Court S W Byron Center MI 49315 8354 U S A Tel 616 878 0270 Toll Free 1 800 537 7320 Fax 616 878 0280 www espec com Agilent Technologies Test and Measurement Support Services and Assistance Agilent Technologies aims to maximize the value you receive while minimizing your risk and problems We strive to ensure that you get the test and measurement capabilities you paid for and obtain the support you need Our extensive support resources and services can help you choose the right Agilent products for your applications and apply them successfully Every instrument and system we sell has a global warranty Two concepts underlie Agilent s overall support policy Our Promise and Your Advantage Our Promise Our Promise means your Agilent test and measurement equipment will meet its advertised performance and functionality When you are choosing new equipment we will help you with product information including realistic performance specifications and practical recommendati
15. ctus Phone or Fax United States tel 800 829 4444 fax 800 829 4433 Canada tel 877 894 4414 fax 800 746 4866 China tel 800 810 0189 fax 800 820 2816 Europe tel 31 20 547 2111 Japan Korea tel 080 769 0800 fax 080 769 0900 Latin America tel 305 269 7500 Taiwan tel 0800 047 866 fax 0800 286 331 Other Asia Pacific Countries tel 65 6375 8100 fax 65 6755 0042 tel 81 426 56 7832 fax 81 426 56 7840 Email tm_ap agilent com Contacts revised 1 12 05 Product specifications and descriptions in this document subject to change without notice Agilent Technologies Inc 2000 2003 2004 2005 Printed in USA March 8 2005 5980 1234E vit Agilent Technologies
16. est DUT along with the innovative low loss capacitor calibration Table 3 provides a brief summary of the key differences between Agilent E4991A and network analyzers Low loss capacitor calibration The low loss capacitor calibra tion of the E4991A improves phase measurement accuracy which establishes a reference to the reactance axis 90 degrees in the impedance plane with its near zero resistance Capacitors and inductors are measured close to the reactance axis in the impedance plane making low loss capacitance calibration very effective for ESR and Q measurements See Figure 1 E4S91A E4991A State Filet Ready Bias OFF Cafe Cron ON Deli3 Figure 1 Ls Q characteristics of a chip inductor Table 2 Q measurement accuracy Typical 100 90 so UU o IM R N V so UN U UUN ii Fee foe otal o IME UUN TTI 7 y E A al 20 ill Q 300 wr H y Hie ly Lr y 10 i r T TIM TTT il 0 ee SA E 1M 10M 100M 1G 3G Frequency Hz Q Measurement Accuracy Table 3 Comparison of key characteristics of E4991A and network analyzers E4991A Network analyzers Device type 1 port devices such as inductors 2 port devices such as filters capacitors and others amplifiers and others S parameters I 8 e Frequency e Test signal level Prepare custom test fixture or use Agilent channel partner solution e Accurate impedance measurement around 50 Q Measurement Z Y 9 R
17. from 55 C to 150 C with a powerful temperature drift compensation function Figure 19 shows the typical 10 measurement accuracy range of the E4991A compared to the 4291B The 4291B requires both low and high impedance test heads for obtaining the wide impedance measurement range On the other hand the E4991A covers the wider impedance measurement range with a single test head 10 Measurement Accuracy Comparison Chart 991A 007 Osc Level 3 13 23dBm Ave 2 8 ATS 4291B 013 014 Osc Level 26dBm Ave 8 ATS Li Frequency MHz Figure 19 Typical 10 measurement accuracy comparison chart VBA sample program va Test fixture station The temperature drift compensa tion function is a new technology that is adopted in the E4991A Unlike the 4291B open short compensation can be performed at pre defined temperature points so that temperature drift errors can be drastically reduced as shown in Figure 20 Easy integration with the ESPEC temperature chamber ESPEC supplies a temperature chamber while Agilent provides all other necessary accessories and a sample program for creat ing an automated temperature characteristic test system Figure 21 shows the contents of the E4991A Option E4991A 007 2 Typical Effects of Themperature Drift on Measurement Accuracy DUT Impedance Value 260 Q Frequency GHz Figure 20 Effect of the temperature drift compensation funct
18. h fie ee Yew Smis Semp Meas FirmatMath Scale Myher Window Cal Sistem teb sial x Z 2 WIA Yow pmis Sump Formaat Maher Window Cal System Ee Tas OF GFA GeenON Oalwe2 IZS Rasy Bac OFF CIRA CugnON Da2 Figure 3 Mouse operation example DC bias function Option E4991A 001 For components with voltage and current dependency such as RF inductors or ceramic capacitors the DC bias function Option E4991A 001 supplies DC voltage 40 V and current bias 50 mA across the device You can easily observe your device behavior under various DC bias conditions without using an external DC bias source External DC bias adapter If you require even higher DC current bias the Agilent 16200B external DC bias adapter allows you to apply larger DC bias across the device of up to 5 A through a 7 mm test port by using an external DC current source E4991A operating frequency is limited to 1 GHz with the 16200B Extracting the equivalent circuit parameters The equivalent circuit analysis function offers more detailed circuit models over the standard 2 parameter model Five different multi parameter models accom modate different types of devices such as ceramic capacitors or crystal resonators You can simulate the impedance trace of your own equivalent parameter values and then compare it with actual measurement traces The extracted parameters can also be used with electronic design automation ED
19. ion ana AnD i Extension cable Figure 21 Contents of the E4991A Option E4991A 007 A VBA sample program is compatible with the ESPEC bench top temperature chamber SU 261 so that you can easily integrate an automated tempera ture characteristic test system Figure 22 The SU 261 provides a wide temperature range from 60 C to 150 C which covers the entire temperature range of Option E4991A 007 Also this sample program can be modified to fit other companies tempera ture chambers In addition the VBA sample program provides an intuitive GUI interface which provides the temperature chamber control measurement parameter setup and temperature profile setup with easy operation Figure 22 The E4991A Option E4991A 007 with the ESPEC bench top temperature chamber SU 261 High temperature cable 1 ESPEC is an Agilent channel partner 2 The Agilent 82357A USB GPIB interface is required to control the chamber from the E4991A The USB GPIB interface is not included in the Option E4991A 007 Test Fixture Accessories 16197A bottom electrode SMD test fixture Designed for bottom electrode SMDs up to 3 GHz Adjustable electrodes accommodate a wide array of sizes This fixture is designed to evaluate SMDs between 0 6 mm and 3 2 mm in length Figure 23 16197A 16196A B C D parallel electrode SMD test fixture Designed for side electrode SMDs up to 3 GHz Dedicated design for specific shape of the device
20. ons from experienced test engineers When you receive your new Agilent equipment we can help verify that it works properly and help with initial product operation Your Advantage Your Advantage means that Agilent offers a wide range of additional expert test and measurement services which you can purchase according to your unique technical and business needs Solve problems efficiently and gain a competitive edge by contracting with us for calibration extra cost upgrades out of warranty repairs and onsite education and training as well as design system integra tion project management and other professional engineer ing services Experienced Agilent engineers and technicians worldwide can help you maximize your produc tivity optimize the return on investment of your Agilent instruments and systems and obtain dependable measure ment accuracy for the life of those products Agilent T amp M Software and Connectivity Agilent s Test and Measurement software and connectivity products solutions and developer network allows you to take time out of connecting your instruments to your com puter with tools based on PC standards so you can focus on your tasks not on your connections Visit www agilent com find connectivity for more information For more information on Agilent Technologies products applications or services please contact your local Agilent office The complete list is available at www agilent com find conta
21. s eliminates repeatability errors and significantly improves usability 0603 inch 1608 mm 16196A 0402 inch 1005 mm 16196B 0201 inch 0603 mm 16196C and 01005 inch 0402 mm 16196D are supported Figure 24 16196A B C 16191A bottom electrode SMD test fixture Designed for bottom electrode SMDs up to 2 GHz Adjustable electrodes accommodate a wide array of sizes This fixture is designed to evaluate SMDs between 2 0 mm and 12 0 mm in length Figure 25 16191A 1 Option E4991A 001 is required 2 Frequency is limited to 2 GHz 3 Option 16197A 001 16192A parallel electrode SMD test fixture Holds chip devices with electrodes on both sides up to 2 GHz Adjustable electrodes can accommodate a wide array of sizes This fixture is adapted to evalu ate SMDs between 1 0 mm and 20 0 mm in length Figure 26 16192A 16194A parallel electrode SMD test fixture Holds both lead devices and SMDs up to 2 GHz It is furnished with two device holders that can be easily attached to measure either type of DUT Figure 27 16194A SMD test fixture selection guide electrodes SMD electrode SMD z 161978 16197A 16197A 16197A 1206 inch 3216 mm 16197A 1210 inch 3225 mm 16197A Over 1210 inch 3225 mm 16191A2 DUT size 01005 inch 0603 mm 0201 inch 0603 mm 0402 inch 1005 mm 0603 inch 1608 mm 0805 inch 2012 mm 13 E4991A Configuration and Accessory Guide Ordering information
22. s such as spreadsheets through a file or via the clipboard 44 Microsoft Visual Basic E4991A State Filel Bile Edt View Insert Format Debug Run Tools Add Ins Window Help Ba Wetec nak ReH O toyect y BAProject I im YBAProject1 E4991A State File1 E Forms UserFormt fa E4991A State Filel U fel E3 Properties UserForm x ComboBoxt Change UserFormi UserForm X ond aoe Alphabetic Categorized UserForm1 C amp H8000000F amp BR SHS00000 1 2 amp 0 frnBorderStyleNone UserForm True Tahoma ForeColor BB 2200000128 Height 199 5 Figure 10 VBA Be Date Display Untitied Eile Edit View Insert Text Marker Helo 514 R 5 D alale inductor B A iroroma S 1 1 1 inductor S t 1 Li L 904 74 pH R 15 989 mOhm S PARAMETERS SP1 Start 1 MHz Stop 3 GHz Step 0 250 0 125 5 8 Jj Figure 11 ADS figure N Microsolt Excel Booki Elo gdt View Insert Format Toots Chart window Help ama Saanya mesae aes FAMILA F4991A State Filet 176 11EH 875285 1 gt db Sheeti Sheet Sheets Ready BisrOFF CaF CmonON Da2 Figure 12 Remote user interface IE 51S IS Ooo 2 6 DL le lal aes O o If 0 SI tala Nes Material Analysis Made Easy The dielectric and magnetic measurement software Option E4991A 002 provides direct readout of m
23. ters Basic impedance accuracy Test port Sweep parameters Calibration Fixture compensation Mass storage 0 8 7 mm connector hard disk drive Other features Agilent provides various test fixtures for SMDs designed to help you obtain the impedance parameters with high repeatability The E4991A offers impedance measurement capabilities for your needs today and into the future e Accurate and versatile 3 GHz impedance measurement solution e Analyze passive component behavior e Wide range of test fixtures available e PC connectivity features with Windows based technology 1 MHz to 3 GHz 1 mHz resolution Z 87 Y Oy R X G B Cg Cp Lg Lp Rp Rg D O T Or Ty Fy le Err Er Mel My Mr O tand Frequency AC signal level DC bias level Open short 50 Q low loss capacitor Open short fixture electrical length 3 1 2 inch floppy disk drive MS DOS format Equivalent circuit analysis function Built in VBA for internal programming Segment sweep DC bias Option E4991A 001 DC level 0 V 40 V 1 mV resolution 100 uA 50 mA 100 uA 50 mA 10 uA resolution 1 Option E4991A 002 is required Advanced Solution for RF Impedance and Material Measurement The E4991A provides a powerful tool for component manufacturing R amp D engineers and circuit designers of wireless and digital equipment who want to evaluate components from various per spectives The following are
24. ure too This is another benefit of dedicated impedance analyzers What is E4991A Option E4991A 010 The E4991A Option E4991A 010 includes following items e Smaller E4991A test head e Extension cables e 7mm 3 5mm f adapter x 1 ea e N m SMA f adapter x 3 ea e Installation manual Agilent E4991A RF impedance material analyzer Agilent E4991A probe station connection kit Option E4991A 010 What else do you need for a system Besides the E4991A with Option E4991A 010 a probe station and probe heads need to be purchased separately This option works with any probe stations but we recommend Cascade Microtech probe sta tions because this combination was carefully checked to work well The following are product examples e Summit 9000 11000 or 12000 series probe station ACP series or HPC series probe head Impedance Standard Substrate ISS Adjustable mounting plate for the E4991A test head Semi rigid cable for the probe head connection These products are provided by Cascade Microtech Inc 11 Integrated Temperature Characteristic Testing A temperature characteristic test solution is now available The temperature characteristic test kit E4991A Option E4991A 007 is a new solution of temper ature characteristic measurement for components and materials This solution provides highly accurate temperature character istic analysis capability within the wide temperature range

Agilent E4991A RF Impedance/ Material Analyzer

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