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Service Manual - HP 1652b Logic Analyzer Manuals and Disks

1. 2 Set the rear panel INTENSITY control to its minimum setting 3 Refer to figure 4 2 for the adjustment locations FOCUS SUB BRIGHT CONTRAST HEIGHT V LIN V HOLD H PHASE 54502E 10 Figure 4 2 CRT Adjustment Locations Adjustments and Calibration HP 1652B 1653B 4 4 Service Manual 4 Adjust the sweep board SUB BRIGHT control to the lowest setting of brightness where the menu is still visible on the CRT screen i U High voltages exist on the sweep board Avoid contact with the sweep board when Caution making CRT adjustments 5 Adjust the rear panel INTENSITY control to bring up the intensity level on screen Screen intensity should be at a comfortable viewing level and the position of both adjustments should be close to mid range uc Setting the intensity level excessively high may shorten the life of the CRT For Note i optimum usage set the intensity as low as possible while maintaining a comfortable viewing level 6 Press RUN and then STOP 7 Adjust the sweep board CONTRAST control so that the error message is easily seen Focus Adjustment 1 Refer to the previous figure 4 2 for the adjustment locations 2 Press the DISPLAY key to place the Timing Waveforms menu on the screen of the HP 1652B 1653B 3 Adjust the sweep board FOCUS control for sharp pixels in the center of the screen menu Then note the FOCUS control position 4 Adjust the sweep board FOCUS for sharp pixels at the corners of th
2. ea END 01650F02 Figure 6C 2 Trouble Isolation Flowchart for Fan Fuse HP 1652B 1653B Troubleshooting Service Manual 6C 3 CHART 3 REMOVE SWEEP CABLE FROM SWEEP BOARD P CA a REPLACE CRT OK MONTIOR ASSEMBLY POWER SUPPLY VOLTAGES OK REMOVE DISK DRIVE CABLE FROM DISK DRIVE REPLACE SWEEP CABLE POWER DISK DRIVE V A CABLE REPLACE DISK EQ SE CONTINUITY DRIVE ASSEMBLY OK MM SS USL D REPLACE ASSEMBLY BOARD CABLE FROM DISK DRIVE CABLE POWER SUPPLY POWER OSCILLOSCOPE REPLACE SUPPLY VOLTAGES ASSEMBLY CABLE OSCILLOSCOPE OK CONTINUITY ASSEMBLY OK NO NO REMOVE SYSTEM ASSEMBLY BOARD CABLE FROM POWER SUPPLY REPLACE OSCILLOSCOPE ASSEMBLY CABLE REPLACE SYSTEM BOARD SYSTEM ASSEMBLY CABLE CONTINUITY OK POWER SUPPLY VOLTAGES OK REPLACE SYSTEM ASSEMBLY CABLE REPLACE POWER END SUPPLY ASSEMBLY Figure 6C 3 Trouble Isolation for Power Supply Troubleshooting HP 1652B 1653B 6C 4 Service Manual DISCONNECT SWEEP CABLE FROM SWEEP BOARD CHECK FOR VOLTAGES AND SIGNALS IN TABLE 6C 2 AND SCALE REPLACE CRT OK MONITOR ASSEMBLY SWEEP CABLE CONTINUITY OK REPLACE SWEEP CABLE REPLACE SYSTEM BOARD ASSEMBLY END 01652B13 Figure 6C 4 Trouble Isolation for CRT Monitor HP 1652B 1653B Trouble
3. 4 In the State Format Specification assign the Clock Period to lt 60 ns and the rising edge of the J clock to the Clock field Also assign the lower 8 channels of the pod under test to a label as in the previous figure 3 13 5 Set the State Trace Specification without sequencing levels and set the Count to Off as in the previous figure 3 14 HP 1652B 1653B Performance Tests Service Manual 3 19 6 Press RUN The State Listing is displayed and shows alternating Fs and Os for the channels under test as in figure 3 21 MACHINE State Listing Markers Off Label gt Base gt Figure 3 21 State Listing for Data Test 4 Toensure a consistent pattern of alternating Fs and Os use the front panel ROLL Note a field and knob to scroll through the State Listing 7 Connect the next clock to the test connector and repeat steps 4 and 6 until all clocks have been tested clocks J K L M and N 8 Remove the probe tip assembly from the logic analyzer probe cable and attach it to the next logic analyzer probe cable to be tested Take care not to dislodge grabbers from the test connector 9 Repeat steps 3 4 6 and 7 until the lower bits of all pods have been tested pods 1 through 5 10 Disconnect the lower eight bits bits 0 through 7 from the test connector and attach the upper eight bits bits 8 through 15 to the test connector 11 Repeat steps 3 4 6 7 and 8 until the upper bits of all pods pods 1 thro
4. If the 5 volts does not appear on one or both of these pins pins 1 and 39 replace the analyzer cable If the 5 volts still does not appear on these pins refer to chart 3 1n figure 6C 3 1 5Y 2 GND 40 GND 39 5V 01650E67 Figure 6C 13 Cable Power and Ground Troubleshooting HP 1652B 1653B 6C 16 Service Manual Contents Section 6D Assembly Removal and Replacement IntrOdUCBOoD uso e o vi e ett da 6D 1 Removal and Replacement of the Rear Panel Assembly 6D 3 Removal and Replacement of the Disk Drive eee ee eee 6D 4 Removal and Replacement of the Power Supply Assembly 6D 5 Removal and Replacement of the Oscilloscope Assembly 6D 5 Removal and Replacement of the Attenuators oooooomooomoomoo 6D 7 Removal and Replacement of the Keyboard Assembly 6D 8 Disassembling the Keyboard Assembly ooooooooommmmmm o 6D 9 Removal and Replacement of the Fan cc ccc cee tee ees 6D 10 Removal and Replacement of the Main Assembly 6D 10 Removal and Replacement of the CRT Monitor Assembly 6D 11 Removal and Replacement of the Feet Tilt Stand 6D 12 6D Assembly Removal and Replacement Introduction Warning WY Caution U Caution U HP 1652B 1653B Service Manual This section contains the procedures for removal and installa
5. Indicates Hazardous Voltages Earth terminal sometimes used in manual to indicate circuit common connected to grounded chassis The WARNING sign denotes a hazard It calls attention to a procedure practice or the like which if not correctly performed or adhered to could result in personal injury Do not proceed beyond a WARNING sign until the indicated conditions are fully understood and met The CAUTION sign denotes a hazard It calls attention to an operating procedure practice or the like which if not correctly performed or adhered to could result in damage to or destruction of part or all of the product Do not proceed beyond a CAUTION sign until the indicated conditions are fully understood or met Printing History A A A A MCI MM E New editions are complete revisions of the manual Update packages which are issued between editions contain additional and replacement pages to be merged into the manual by the customer The dates on the title page change only when a new edition is published A software and or firmware code may be printed before the date this indicates the version level of the software and or firmware of this product at the time of the manual or update was issued Many product updates and fixes do not require manual changes and conversely manual corrections may be done without accompanying product changes Therefore do not expect a one to one correspondence between product updates and manual updates Edi
6. sample period channel to channel skew 0 01 of time interval reading Trigger Specification Asynchronous Pattern Trigger on an asynchronous pattern less than or greater than a specified duration The pattern is the logical AND of a specified low high or don t care for each assigned channel If the pattern is valid but the duration is invalid there is a 20 ns reset time before the instrument will look for patterns again Greater Than Duration Minimum duration is 30 ns to 10 ms with 10 ns or 0 01 resolution whichever is greater Accuracy is 0 ns to 20 ns Trigger occurs at pattern duration Less Than Duration Maximum duration is 40 ns to 10 ms with 10 ns or 0 01 resolution whichever is greater Pattern must be valid for at least 20 ns Accuracy is 20 ns to 0 ns Trigger occurs at the end of the pattern Glitch Edge Triggering Trigger on a glitch or edge following a valid duration of an asynchronous pattern while the pattern is still present Edge can be specified as rising falling or either Less than duration forces glitch and edge triggering off Autoscale Timing Analyzer Only Autoscale searches for and displays channels with activity on the pods assigned to the timing analyzer Acquisition Specifications Arming Each analyzer can be armed by the run key the other analyzer the oscilloscope or the external trigger in port Trace Mode Single mode acquires data once per trace specification Repetitive
7. Received Data RD Request to Send RTS Clear to Send CTS Data Set Ready DSR Signal Ground Data Carrier Detect DCD Data Terminal Ready DTR Data Signal Rate Selector RS 232 C Standard BA BB CA CB CC CF CD CH CI Signal Direction and Level Not applicable Data from Mainframe High Space 0 12V Low Mark 1 12 V Data to Mainframe High Space 0 3 V to 25 V Low Mark 1 3 V to 25 V Signal from Mainframe High ON 12 V Low OFF 12 V Signal to Mainframe High ON 3Vto 12V Low OFF 3 V to 25 V Signal to Mainframe High ON 3Vto 25 V Low OFF 3 V to 25 V Not applicable Signal to Mainframe High ON 3Vto 25 V Low OFF 3 V to 25 V Signal from Mainframe High ON 12V Low OFF 12 V Signal from Mainframe Always High ON 12V HP 1652B 1653B Service Manual A 3 Bl 3 A o VVkkgVg Degaussing the Display If the instrument has been subjected to strong magnetic fields the CRT may become magnetized and display data may become distorted To correct this condition it may be necessary to degauss the CRT with a conventional external television type degaussing coil A T OV w amp E a VA Operating Environment The operating environment for the HP 1652B 1653B is described in section 1 of this manual Note the non condensing humidity limitation Condensation within
8. Service Manual Kip HEWLETT PACKARD HEWLETT PACKARD 3 SERVICE MANUAL HP 1652B 1653B Logic Analyzers SERIAL NUMBERS This manual applies directly to instruments prefixed with serial number 2941A 2942A 3011A 3012A For Additional Information about serial numbers see INSTRUMENTS COVERED BY THIS MANUAL in Section 1 COPYRIGHT HEWLETT PACKARD COMPANY COLORADO DIVISION 1989 1900 GARDEN OF THE GODS ROAD COLORADO SPRINGS COLORADO U S A ALL RIGHTS RESERVED Manual Part No 01652 90905 Microfiche Part No 01652 90805 Printed in U S A February 1990 CERTIFICATION Hewlett Packard Company certifies that this product met its published specifications at the time of ship ment from the factory Hewlett Packard further certifies that its calibration measurements are traceable to the United States National Institute of Standards and Technology to the extent allowed by the Institute s calibration facility and to the calibration facilities of other International Standards Organization members WARRANTY This Hewlett Packard product is warranted against defects in material and workmanship for a period of one year from date of shipment During the warranty period Hewlett Packard Company will at its option either repair or replace products which prove to be defective For warranty service or repair this product must be returned to a service facility designated by HP Buyer shall prepay shipping charges to HP and
9. 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 Mfr Part Number 01652 66501 01653 66501 01652 66503 2090 0204 0960 0753 0950 1879 0950 1798 01650 61614 9135 0325 01650 61608 01650 61608 01652 66502 54503 63401 10430A 3160 0429 5959 9333 5959 9334 5959 9335 5959 0288 5959 0288 2110 0003 0535 0113 0535 0056 2950 0001 2950 0072 0515 0372 0515 0821 0515 1035 0515 1135 0515 1951 01650 82401 2190 0009 2190 0016 2190 0027 3160 0092 0590 1868 1400 061 1 0380 1482 01650 00203 2950 0054 3050 0893 Replaceable Parts 5 5 Table 5 2 Replaceable Parts List continued Reference HP Part Mfr Mfr Part Designator Number CD Qty Description Code Number H21 0515 0374 4 6 SCREW MACH M3 0 X 0 50 OSCILLOSCOPE BOARD 28480 0515 0374 H22 0515 1246 1 4 SCREW MACH M3 X 0 5 ATTENUATOR 28480 0515 1246 H23 2950 0035 8 1 NUT 468 32 078 PROBE COMPENSATION BNC 28480 2950 0035 H24 2190 0068 5 3 WASHER LK 505 630 02 ATTENUATOR 28480 2190 0068 MP1 01650 45207 7 1 CABINET MOLDED PLASTIC 28480 01650 45207 MP2 01650 04901 2 1 BALE HANDLE 28480 01650 04901 MP3 1460 1345 5 2 TILT STAND SST 28480 1460 1345 MP4 01650 47701 0 2 MOLDED FOOT 28480 01650 47701 MP5 01650 01202 0 1 GROUND BRACKET 28480 01650 01202 MP6 01652 94302 8 1 IDENTIFICATION LABEL 1652B 28480 01652 94302 MP6 01653 94302 9 1 IDENTIFICATION LABEL 1653B 28480 01653 94302 MP7 01652 94301 7 1 KEYBOARD LABEL 28480 01652 9
10. 3 dB dc to 100 MHz single shot DC Gain Accuracy 3 of full scale DC Offset Accuracy 2 mV 2 of the channel offset 2 5 of full scale Voltage Measurement Accuracy DC Gain accuracy ADC resolution Offset accuracy Horizontal Time Interval Measurement Accuracy 2 X s div 0 01 X delta t 500 ps Trigger Sensitivity 10 of full screen Oscillosco pe The following operating characteristics are not specifications but are typical Operatin operating characteristics for the oscilloscope in the HP 1652B 1653B These are P g included as additional information for the user Characteristics Vertical Transition Time 10 to 90 lt 3 5 ns at BNC Number of Channels 2 Vertical Sensitivity Range 15 mV div to 10 V div 1 1 probe Vertical Sensitivity Resolution Adjustable 2 digit resolution Maximum Sample Rate 400 MSamples second Analog to Digital Conversion 6 bit real time Analog to Digital Resolution 1 6 of full scale Waveform Record Length 2048 points Input R 1 MQ 1 or 50 Q 1 Input C Approximately 7 pF Input Coupling dc HP 1652B 1653B General Information Service Manual 1 15 Maximum Safe Input Voltage 1 MQ input 250 V dc peak ac 10 kHz 50 2 input 5VRMS DC Offset Range 1 1 Probe Vertical Sensitivity Available Offset lt 50 mV div 2 0 V 100 mV div 200 mV div 10 V 500 mV div 1 V div 50 V gt 2 V div 125 V 5 V max if inpu
11. HP 1652B 1653B Assembly Removal and Replacement Service Manual 6D 3 Removal and 1 Turn off the instrument and disconnect the power cable Replaceme nt of 2 Remove the six screws from the top and the two screws from each side of the the Disk Drive instrument s top cover 3 Lift off the top cover 4 Remove the two screws securing the disk drive to the power supply panel 5 Disconnect the disk drive cable assembly W3 from the disk drive i W Do not match the arrows of the cable and connector when reconnecting the disk Caution drive cable to the disk drive The connector of the disk drive is marked with an arrow at pin 34 of the connector The end of the disk drive cable is marked at pin 1 of the cable Matching the arrows will result in damaging the disk drive 6 Slide the disk drive through the front panel of the instrument cabinet as in figure 6D 2 7 Replace the disk drive by reversing this procedure When you reinstall the top cover insert the four screws on the sides of the cover Note first while making sure the cover fits into the grooves of the instrument cabinet Then insert the six screws in the top of the cover POWER SUPPLY O1653E 10 DISK DRIVE Figure 6D 2 Disk Drive and Power Supply Removal Assembly Removal and Replacement HP 1652B 1653B 6D 4 Service Manual E nee Removal and Replacement of the Power Supply Assembly ud Note wj When necessary refer to other removal procedures 1
12. Running Disk Test appears on screen while the instrument is performing the test When the test is finished the message Disk Test complete will appear on screen 3 If you are running repetitive tests press the front panel STOP key when you want to discontinue the test The number of runs and failures will be displayed in the menu 4 Toreturn to HP 1652B 1653B Self Tests menu move the cursor to Done and press SELECT Self Tests HP 1652B 1653B 6B 6 Service Manual Cycle Through Cycle through tests allows you to cycle through the following tests Test T Analyzer Data Acquisition Scope Data Acquisition BNC RAM ROM Disk Drive In HP 1652B 1653B Self Tests menu move the cursor to Cycle through tests and press SELECT ay The tests listed above will run consecutively and continually until the front panel STOP key is pressed 2 Press the front panel STOP key to end the continuous tests 3 To see the results of the tests for individual tests move the cursor to the appropriate test and press SELECT The number of runs and failures of the continuous test will be displayed on the individual self test menu 4 Move the cursor to Done and press SELECT to return to the HP 1652B 1653B Self Tests menu HP 1652B 1653B Self Tests Service Manual 6B 7 Contents WERE ee ps ee a ae ee ee ee Section 6C Troubleshooting Introduccion os Ode odd 6C 1 Sal idad aio 6C 1 Trouble Isolation Flowcharts ooooooooooo
13. Turn off the instrument and disconnect the power cable 2 Remove the six screws from the top and the two screws from each side of the instrument s top cover 3 Lift off the top cover 4 Remove the Disk Drive 5 Remove the disk drive cable assembly W3 from the disk drive panel and let it lay off the side of the instrument 6 Remove the cable W2 that connects the Power Supply to the Main Assembly 7 Disconnect the line filter cable from the Power Supply 8 Remove the two locking pins that secure the Power Supply at the right front and rear corners of the instrument cabinet Pull these pins up and out of the instrument 9 Slide the power supply through the side of the cabinet as in the previous figure 6D 2 10 Replace the power supply by reversing this procedure When you reinstall the top cover insert the four screws on the sides of the cover first while making sure the cover fits into the grooves of the instrument cabinet Then insert the six screws in the top of the cover I Removal and Replacement of the Oscilloscope Assembly HP 1652B 1653B Service Manual When necessary refer to other removal procedures 1 Turn off the instrument and disconnect the power cable 2 Remove the six screws from the top and the two screws from each side of the instrument s top cover Lift off the top cover Remove the Disk Drive and Power Supply Remove the Line Filter Switch Assembly from the rear p
14. Width WID 11 ns 10 ns Leading Edge LEE 1 ns 1 ns Trailing Edge TRE 1 ns 1 ns High Level HIL 3 2 V 3 2V Low Level LOL OV OV Delay DEL Ons Ons Double Pulse DBL 28 5 ns Output Mode ENABLE ENABLE 3 Assign the pod under test to Analyzer 1 in the System Configuration as in the previous figure 3 5 4 In the State Format Specification menu assign the Clock Period to 60 ns and the falling edge of J clock to the Clock field Also assign the lower 8 channels of the pod under test to a label as in the previous test figure 3 13 5 Set the State Trace Specification without sequencing levels and set Count to Off as in the previous test figure 3 14 6 Press RUN The State Listing is displayed and lists alternating Fs and Os as in figure 3 18 MACHINE State Listing Merkers Off Label gt Base gt 0000 Figure 3 18 State Listing for Data Test 3 Performance Tests HP 1652B 1653B 3 16 Service Manual ua To ensure a consistent pattern of alternating Fs and Os use the front panel ROLL Note field and knob to scroll through the State Listing 7 Connect the next clock to the test connector and repeat steps 4 and 6 for the appropriate clock Repeat these steps until the J K M and N clocks have been tested 8 Remove the probe tip assembly from the logic analyzer probe cable and attach it to the next logic analyzer probe cable to be tested Take care not to dislodge grabbers from the test connector R
15. eee eese d kanina a ehh hn 12 9 User Interface cec EUR x eot va aou eo ete ref ioi qudd dude aes 2 5 FIP IB Interaccion Net mast tope E ar 2 5 HP IB Address Selection 4532 btt epe ed pA d eb eae E ulis 2 6 Contents 1 ERS 232 C Interface vss SOLE E mec o ec e pp ce Er anes das 2 7 RS 232 C Configuration ccc osculo stub DER e bom rur Ede eese 2 7 Degaussine the Display caia 2 9 Operatic Environment oco os eed o tbe a RE suede cdita 2 9 Storage and Shipment sitiar VPN eb ira vates 2 0 Tacoma Or SGEVICB xe ebbe ND Oboe ea bees oia n eS Dudes dee 2 9 Oneinal Packapo ss sa 2 9 Other Packaglfig o ooi i eode eva e T bein eO RO tra 2 10 Eleanme Requr mcals siria ri 2 10 Section 3 Performance Tests IntroductiODa opo heros Ex UT eee use eee tetanus Ren vedaccetop da 3 1 Recommended Test Equipment session aiu s bts 3 1 Test IRGCOEQ ds eines 3 1 Sell Tests oc dcdit ui Edo be E ted deut eee nee pd Me 3 1 Power upsell Test 2 025 oen ais 3 2 Selectable Sell Tests usse edo E EE DER E E eR I NE Pede Sed 3 2 Pertormance Test Interval 24255 p o has AS NH RENS S 3 3 Performance Test Procedures iii e dade IE RUE RE ERAS 3 3 Logic Analyzer Performance Tests 02 ce cece eee e reece tee eees 3 5 Test COMME COR oes E toos mb cert ed ete Bof up aang eave wean menses 3 5 Clock Qualifier and Data Inputs Test 1 00000 008 36 Clock Qualifier and Data Inputs Test 2 ooooooooomomomo mo n 3 11
16. gt Label Po 15 Figure 3 8 Bit Assignment for Data Test 1 5 Set up the State Trace Specification without sequencing levels and set Count States as in figure 3 9 Refer to steps a through c if you are unfamiliar with menus MACHINE j State Trace Specification Trace mode Sequence Levels Armed by While storing any state Trigger on a times Brenches Store any state ort Count States Prestore Off Figure 3 9 Trace Specification for Data Test 1 a Press the front panel TRACE TRIG key b Move the cursor to Count and press SELECT c Move the cursor to States press SELECT and set it to any state by pressing SELECT again HP 1652B 1653B Performance Tests Service Manual 3 9 6 Press RUN The State Listing is displayed and shows Fs for the channels under test as in figure 3 10 MACHINE State Listing Markers Off 0 0 Q 0 0 0 0 0 0 0 0 0 0 0 Figure 3 10 State Listing for Data Test 1 ui To ensure a consistent pattern of Fs in the listing use the front panel ROLL field Note ae and knob to scroll through the State Listing 7 If you are testing the HP 1653B connect the K clock of Pod 2 to the test connector and repeat steps 4 and 6 for the falling edge of the K clock 8 Remove the probe tip assembly from the logic analyzer probe cable and attach it to the next logic analyzer probe cable to be tested Take care not to dislodge grabbers from the test connector
17. or after the beginning of data The 0 marker can also find the nth occurrence of a pattern before or after the X marker Statistics The X to 0 marker statistics are calculated for repetitive acquisitions Patterns must be specified for both markers and statistics are kept only when both patterns can be found in an acquisition Statistics are minimum X to 0 time maximum X to 0 time average X to 0 time and ratio of valid runs to total runs Run Stop Functions Run Starts the acquisition of data in a specified trace mode Stop In single trace mode or the first run of a repetitive acquisition STOP halts the acquisition and displays the current acquisition data For subsequent runs in repetitive mode STOP halts the acquisition of data and does not change current display Data Display Entry Display Modes State listing timing waveforms interleaved time correlated listing of two state analyzers time tagging on time correlated state listing and timing waveform display state listing in upper half timing waveform in lower half and time tagging on Timing Waveform Pattern readout of timing waveforms at X or 0 marker Bases Binary Octal Decimal Hexadecimal ASCII display only and User defined symbols General Information 1 13 e o ooo Oscilloscope The following specifications are the performance standards or limits against which Specifications the oscilloscope in the HP 1652B 1653B is tested Vertical Bandwidth
18. ta Input and Data Inputs This performance test verifies the hold time specification for the falling clock Test 3 transitions of the J K M and N clock on the HP 1652B HP 1652B Only Specification HP 1652B Hold time Data must be present after the falling J K M and N clock transition 1 ns Equipment Required Pulse Generator oooooooo HP 8161A 020 Oscilloscope 4 45554 cbr dr NE E HP 54502A 50 Ohm Feedthrough 2 HP 10100C Test Connector 2 see figure 3 1 and 3 2 BNC m m Coupler 2 HP 1250 0216 BNC Cable 2 cursi ede d Eds eis HP 10503A BNC Tee m f f 2 oooooo oo HP 1250 0781 Procedure 1 Connect the HP 1652B and test equipment as in figure 3 16 OSCILLOSCOPE PULSE GENERATOR LOGIC ANALYZER omo occu B 6 ed ni 3 1 NEUE Figure 3 16 Setup for Data Test 3 01650849 ud In this setup only eight channels are tested at one time to minimize loading The Note wi ground lead must be connected to ensure accurate test results HP 1652B 1653B Performance Tests Service Manual 3 15 2 Adjust the pulse generator for the outputs in figure 3 17 28 5NS meme oig y S CLOCK OUTPUT B A I ut 57NS AA cg E Uig DATA OUTPUT A ON 01650012 Figure 3 17 Waveform for Data Test 3 Setting for HP 8161A Parameter Output A Output B Input Mode Norm Period PER 57 ns
19. ucl If necessary after replacing the CRT Monitor Assembly perform the CRT Note a Monitor Assembly Adjustment procedures in section 4 of this manual uel When you reinstall the top cover insert the four screws on the sides of the cover Note i first while making sure the cover fits into the grooves of the instrument cabinet Then insert the six screws in the top of the cover Removal and When necessary refer to other removal procedures Replacement of 1 Turn off the instrument and disconnect the power cable the Feet Tilt l Stand 2 Remove the six screws from the top and the two screws from each side of the an instrument s top cover 3 Lift off the top cover 4 Remove the Rear Panel Power Supply Main Assembly and CRT Monitor Assembly 5 Remove the three screws securing each foot tilt stand to the bottom of the instrument cabinet 6 Replace the feet tilt stand by reversing this procedure uc When you reinstall the top cover insert the four screws on the sides of the cover Note iP first while making sure the cover fits into the grooves of the instrument cabinet g gr Then insert the six screws in the top of the cover Assembly Removal and Replacement HP 1652B 1653B 6D 12 Service Manual HP 1652B 1653B t o005 m onvom Logic Analyzers Service Manual LA
20. 43 5V 5 20V ADJ 12V 5 2V 12V 5 20V NEI Ta 00000000 NW 6 ESS EX OQggpoooooooooooOo IA JPN D POWER SUPPLY OUTPUT CABLE 01650 64 POWER SUPPLY INPUT CABLE Figure 6C 12 Power Supply Test Points Power Supply Isolated Isolate and check the supply with the following steps Use the figure above for reference 1 Turn off the instrument and remove the power cable 2 Disconnect the supply output cable at the supply see figure above 3 Load the 5 20 V supply with a 2 ohm 25 watt resistor a With a jumper wire connect one end of the resistor to one of the 5 20 V pins pins 1 through 4 on the supply output b With another jumper wire connect the other end of the resistor to one of the ground pins pins 5 through 8 on the supply output Troubleshooting HP 1652B 1653B 6C 12 Service Manual 4 Reconnect the power cable and turn on the instrument Then check for the voltages at the supply output using the values in the following table Table 6C 2 Power Supply Main Assembly Voltages PIN SIGNAL PIN SIGNAL 5 20 V 5 2 V 5 20 V GROUND 5 20 V 12 V 5 20 V GROUND GROUND Display 12 V GROUND Digital GROUND GROUND Digital 12 V Display GROUND Display 5 2 V 3 5 V 15 5 V Fan GROUND GROUND Fan The ground planes digital fan and display are at the same potential on the Not power supply but when you are measuring them on the main assembly the supplies must be
21. 8 Adjust the signal generator output level for 0 4 divisions of vertical deflection approximately 3 dBm Performance Tests HP 1652B 1653B 3 52 Service Manual 9 Press TRACE TRIG and adjust the trigger Level for a stable display 10 11 12 13 14 15 16 17 18 Auto triggered message does not appear on screen The test passes if triggering is stable as shown in figure 3 65 Scope Waveforms Merkers Off Display Connect dots On Semple period 10 0 ns s Div Delay Grid Figure 3 65 Waveforms Display Menu Press STOP and set the s Div to 5 ns Set the signal generator to 100 MHz and press RUN on the HP 1652B 1653B Adjust the signal generator output level for 0 4 divisions of vertical deflection approximately 3 dBm Press TRACE TRIG and adjust the trigger level for a stable display Auto triggered message does not appear on screen The test passes if triggering is stable Press FORMAT CHAN and set V Div to 200 mV and repeat steps 4 through 13 The signal generator output should be reduced to approximately 17 dBm Press FORMAT CHAN and set V Div to 20 mV and repeat steps 4 through 13 The signal generator output should be set to approximately 37 dBm Turn on channel 2 by inserting a waveform on the display Turn off channel 1 by deleting the channel 1 waveform Connect the signal generator to channel 2 and repeat steps 4 through 15 for channel 2 Trigger sensitivity
22. Aa 5 1 Ordering Information os oet Erde uei e NU REID 5 2 Direct Mal Order Systems oink Pur ERU QEON UE DE edt ed aes 5 2 5 Replaceable Parts Introduction This section contains information for ordering parts Since service support for this instrument is down to the assembly level the replaceable parts list only includes assemblies and chassis parts Figure 5 1 shows an exploded view of the HP 1652B 1653B Logic Analyzer A Abbreviations Table 5 1 lists the abbreviations used in the parts list and throughout this manual In some cases two forms of the abbreviations are used one in all capital letters and one in partial or no capital letters However elsewhere in the manual other abbreviation forms may be used with both lowercase and uppercase letters Replaceable Parts Table 5 2 is a list of replaceable parts and is organized as follows 1 Exchange assemblies in alphanumerical order by reference designation 2 Electrical assemblies in alphanumerical order by reference designation 3 Chassis mounted parts in alphanumerical order by reference designation The information given for each part consists of the following e Reference designation e HP part number e Part number Check Digit CD e Total quantity Oty used in the instrument or on an assembly The total quantity is given once at the first appearance of the part number in the list e Description of the part e Typical manufacturer of the part in
23. Calibration 14 Select the Calibration choice field and when the pop up appears select Gain 15 Select Start with the front panel knob and SELECT key eb 8 To abort the Gain calibration select Cancel using the front panel knob and Note ab SELECT key 16 Disconnect all signals from the channel 1 and 2 inputs of the HP 1652B 1653B oscilloscope Then select Continue using the front panel knob and SELECT key to proceed with the calibration A message will appear on screen to indicate the instrument is performing the calibration 17 When the calibration is complete the updated calibration status appears on screen and the instrument remains in the Calibration menu Trigger Calibration 18 Select the Calibration choice field and when the pop up appears select Trigger level 19 Select Start with the front panel knob and SELECT key ul To abort the Trigger calibration select Cancel using the front panel knob and Note W SELECT key 20 Disconnect all signals from the channel 1 and 2 inputs of the HP 1652B 1653B oscilloscope Then select Continue using the front panel knob and SELECT key to proceed with the calibration A message will appear on screen to indicate the instrument is performing the calibration 21 When the calibration is complete the updated calibration status appears on screen and the instrument remains in the Calibration menu Delay Calibration 22 Select the Calibration choice field and when the pop up appe
24. Equipment Required Signal Generator o oooooooooo HP 8656B BNO Cable 1 enero br didas HP 10503A Type N m Ho BNC f HP 1250 0780 Procedure 1 Use the Type N to BNC adapter to connect the signal generator to channel 1 of the HP 1652B 1653B as in figure 3 62 SIGNAL GENERATOR LOGIC ANALYZER 01652E 16 Figure 3 62 Setup for Trigger Sensitivity 2 In the System Configuration menu turn both State Timing Analyzers off unassign all of the pods from the analyzers and turn the oscilloscope on as in the previous figure 3 44 3 Press FORMAT CHAN and turn on channel 1 by inserting the channel 1 waveform Then turn off channel 2 by deleting the channel 2 waveform HP 1652B 1653B Performance Tests Service Manual 3 51 4 Set Input to CH 1 V Div to 2 V Offset to 0 V Probe to 1 1 Impedance to 50 Ohms and s Div to 2 0 us as in figure 3 63 Scope Channe1 Input V Div 2 000 V Offset Probe 1 1 Impedance SO Ohms Preset s D1v Delay Figure 3 63 Channel Menu Configuration 5 Press TRACE TRIG and set the Run mode to Repetitive and trigger Level to 0 V 6 Press DISPLAY and set Display to Normal Connect dots On and Grid On as in figure 3 64 Scope Waveforms Harkers Off Display Connect dots On Semple period 10 0 ns Delay Grid Figure 3 64 Waveforms Display Menu 7 Set the signal generator to 1 MHz and press RUN on the HP 1652B 1653B
25. General Operation General Warnings and Cautions Warning Caution ZN f 5 W Safety Considerations This is a Safety Class I instrument provided with terminal for protective earthing BEFORE APPLYING POWER verify that the power transformer primary is matched to the available line voltage the correct fuse is installed and Safety Precautions are taken see the following warnings In addition note the instrument s external markings which are described under Safety Symbols e BEFORE SWITCHING ON THE INSTRUMENT the protective earth terminal of the instrument must be connected to the protective conductor of the mains powercord The mains plug shall only be inserted in a socket outlet provided with a protective earth contact The protective action must not be negated by the use of an extension cord power cable without a protective conductor grounding Grounding one conductor of a two conductor outlet is not sufficient protection Servicing instructions are for use by service trained personnel To avoid dangerous electric shock do not perform any servicing unless qualified to do so e Ifthisinstrument is to be energized via an auto transformer for voltage reduction make sure the common terminal is connected to the earth terminal of the power source e Anyinterruption of the protective grounding conductor inside or outside the instrument or disconnecting the protective earth terminal will cause a potential sh
26. HP IB CABLE 28480 01650 61613 W7 01650 61616 6 1 FAN CABLE 28480 01650 61616 w8 01652 61602 2 1 OSCILLOSCOPE CABLE ASSY 60 COND 28480 01652 61602 W9 54100 61610 6 1 PROBE COMPENSATION BNC 28480 54100 61610 Replaceable Parts 5 6 HP 1652B 1653B Service Manual Contents Section 6A Theory of Operation Introducir sia itae P ue edu victis 6A 1 Sara seo 6A 1 Block Leve Theory assi ot A 6A 1 Power Supply Assembly cid a S et eR a 6A 4 CRT Monitor Assembly 22 eos Ne peel th hU EUER S bes ei 6A 4 Main Assembly zio uoa eese ce Mir duse eu bl oH eor 6A 4 Central Processing Unit CPU oe dacpeer enacted bed etia ds 6A 4 Oscilloscope ASSembly session 6A 4 Keypad and Knob Assembly sosessesssesossesesesssesesesens 6A 5 Disk Controller o9 oda ve oaa ou Se P nuper ei diae 6A 5 RS 232 C loterie bends uei tr duit ted bent ss 6A 5 HP IB Interface Pe lbs duo ee 6A 5 Logic Analyzer Theory of Operation o ooooococooccnccronocc ccoo 6A 7 Data Acquisition 415 424 coe eens PE a 6A 7 Amine Control seseratan ra PRUNUS Edut Scb eA PS ce qe 6A 7 Memos tpi Vett ai b p tou ote a adu eee tary uta 6A 8 Oscilloscope Theory of Operation o sese clones Ee HERE oes 6A 9 Attenuator Preamps LC ee ne ee ee Tee ee ee 6A 9 Post AMDUNET Les Ranae memet te ee ipeo Mb Vd E add bep da 6A 9 ADC and FISO MEMO id mt bsstemeee p eae eee ca ee ee qe piso qd 6A 9 A ee he gRr S ad No atona gU ewes datas 6A 9 Time Base satan
27. If you are testing the HP 1653B reassign the falling edge of the J clock 9 Repeat steps 3 4 6 and 7 until all of the pods have been tested 10 Disconnect the lower eight bits bits 0 through 7 from the test connector and attach the upper eight bits bits 8 through 15 to the test connector 11 Repeat steps 3 4 6 7 and 8 until the upper bits of all pods have been tested Performance Tests HP 1652B 1653B 3 10 Service Manual Clock Qualifier Description ta Input and Data T 3 s This test verifies the setup and hold time specification for the rising edge transition of all of the clocks on the HP 1652B 1653B Specification Setup time Data must be present prior to the clock transition gt 10 ns Hold time Data must be present after the rising clock transition 0 ns Equipment Required Pulse Generator ooo ooooooooooo HP 8161A 020 Oscilloscope ou ovens c E Eden HP 54502A 50 Ohm Feedthrough 2 HP 10100C Test Connector 2 see figure 3 1 and 3 2 BNC m m Coupler 2 HP 1250 0216 BNO Gable 2 essa dee edd ees HP 10503A BNC Tee m f f 2 HP 1250 0781 Procedure 1 Connect the HP 1652B 1653B and test equipment as in figure 3 11 OSCILLOSCOPE PULSE GENERATOR LOGIC ANALYZER OMDODVD 01650849 Figure 3 11 Test Setup for Data Test 2 uil In this setup only eight channels are tested at one time to mini
28. Mixed Displays Time Correlation Time Interval Accuracy between Modules Oscilloscope timing and state can occur simultaneously or in series Timing channels and oscilloscope channels can be displayed on the same screen Multiple state machine listings can be displayed with time tags on the same screen Timing channels can be displayed with a state listing with Time Tags turned on State listings with time tags timing channels and oscilloscope channels can be displayed on the same screen All modules are time correlated with the exception of when the oscilloscope is being armed by the logic analyzer and when the oscilloscope is not in trigger immediate mode Equals the sum of channel to channel time interval accuracies of each machine used for a measurement GRU NN NNNNNNNNNURE R General Characteristics Operating Environment HP 1652B 1653B Service Manual The following general characteristics for the HP 1652B 1653B include the environment operating conditions shipping weights and instrument dimensions Temperature Instrument Operating 0 C to 55 C 32 F to 131 F Non operating 40 C to 70 C 40 F to 158 F Probes and Cables 0 C to 65 C 32 F to 149 F Disk Media 10 C to 50 C 50 F to 149 F General Information 1 19 Humidity Instrument Operating Up to 9546 relative humidity non condensing at 40 C 104 F Non operating Up to 90 relative humidity at
29. O QA P C M Removal and When necessary refer to other removal procedures Replacement of 1 Turn off the instrument and disconnect the power cable the Keyboard A bl 2 Remove the six screws from the top and the two screws from each side of the ssempiy instrument s top cover 3 Lift off the top cover 4 Remove the Disk Drive Power Supply and Oscilloscope Assembly 5 Loosen the two screws that hold the rear bracket on the oscilloscope assembly support panel until the bracket moves freely 6 Remove the support panel by carefully tilting the rear of the panel up and lifting the panel out through the top of the instrument cabinet Make sure the metal tabs on the front of the support panel clear the front panel REAR SUPPORT BRACKET OSCILLOSCOPE ASSEMBLY SUPPORT PANEL O1653E 11 Figure 6D 4 Support Panel Removal 7 From the back side of the front panel remove the four screws securing the keyboard assembly to the front of the instrument cabinet 8 Disconnect the keyboard assembly ribbon cable from the Main Assembly 9 Pull on the knob to remove the keyboard assembly label keyboard panel keypad PC board RPG and knob from the front panel as one unit Assembly Removal and Replacement HP 1652B 1653B 6D 8 Service Manual Disassembling Use the following steps to disassemble the keyboard assembly the Keyboard Assembly 10 Disconnect the Rotary Pulse Generator RPG cable fro
30. Other Packaging The following general instructions should be followed for repacking the instrument with commercially available materials Remove the disk from disk drive and install a yellow shipping disk Wrap the instrument in heavy paper or plastic Use a strong shipping container A double wall carton made of 350 Ib test material is adequate Use a layer of shock absorbing material 70 to 100 mm 3 to 4 inches thick around all sides of the instrument to provide firm cushioning and prevent movement inside the container Protect the control panel with cardboard Seal the shipping container securely Mark the shipping container FRAGILE to ensure careful handling In any correspondence refer to the instrument by model number and serial number eee Cleaning Requirements Installation 2 10 Use MILD SOAP AND WATER to clean the HP 1652B 1653B cabinet and front panel Care must be taken to not use a harsh soap which may damage the water base paint finish of the instrument HP 1652B 1653B Service Manual Contents Section 3 Performance Tests Brodu OB odis teria ee ees iSi rase RERUM eua seme 3 1 Recommended Test Equipment cece ccc ccc eee e ee eneeees 3 1 ROSE RECO hae ease bond de enna hee eed 3 1 SEIT GSES ahead sodes etus cules aun ae nee ere neeuiesgieatensedupatiatatun 3 1 Power upsell Test aaa Posee x Eau ane itae ubi ate Uribe qu uta 3 2 Selectable Sell Tests 2220s tude mated E da dead 3 2 Per
31. PROBE TIP ASSEMBLY FAILURE FOLLOW THE SUSPECT PROBE TIP ASSEMBLY EXCHANGE SUSPECT POD CABLES WITH KNOWN GOOD CABLES REDO TEST 2 DOES FAILURE FOLLOW THE SUSPECT CABLE REPLACE CABLE S NO REPLACE SYSTEM BOARD ENE 01652B15 Figure 6C 7 Trouble Isolation for Data Acquisition Troubleshooting HP 1652B 1653B 6C 8 Service Manual HP 1652B 1653B Service Manual CHART 6 PERFORM RS 232 C SELF TEST REPLACE SYSTEM BOARD ASSEMBLY VERIFY RS 232 C CONF IGURAT ION OF EXTERNAL EQUIPMENT 01650F08 Figure 6C 8 Trouble Isolation for RS 232C 9 CHART 1 CHART 9 IS HP IB ACCESSIBLE IN I 0 SAY REPLACE CONF IGURATION SYSTEM BOARD MENU YES IS HP IB ADDRESS CORRECT NO SET ADDRESS YES IS CONTROLLER NO CONNECT CONNECTED CONTROLLER PROPERLY YES IS CONTROLLER NO CONFIGURE CONF IGURED CONTROLLER PROPERLY YES IS CONNECT INTERNAL NO HP IB CABLE INTERNAL CONNECTED HP IB CABLE YES REPLACE INTERNAL HP IB CABLE END 01652816 Figure 6C 9 Trouble Isolation for HP IB Troubleshooting 6C 9 CHART 1 CHART 10 PERFORM BNC SELF TEST PROBLEM NO STILL PRESENT YES PANEL CABLES CONNECTED TO SYSTEM ASSEMBL Y NO CONNECT CABLES REPLACE SYSTEM ASSEMBLY Figure 6C 10 Trouble Isola
32. adjustment A1R95 is located beneath the oscilloscope board and is Note P not accessible without dismantling part of the instrument Consequently it is advisable to see if the threshold requires adjustment before dismantling the instrument Perform the Threshold Accuracy Test in section 3 to verify if adjustment is required before executing this procedure 1 Disconnect the power cord from HP 1652B 1653B and remove the top cover 2 Connect the negative lead of the voltmeter to TP GND Refer to figure 4 3 for testpoint and adjustment locations HP 1652B SAME LOCATION ON BOTH BOARDS HP 1653B A1TP3 7 A1TP2 ATROS Z TP GND 01652 17 Figure 4 3 System Board Testpoints and Adjustments Adjustments and Calibration HP 1652B 1653B 4 6 Service Manual Caution A HP 1652B 1653B Service Manual 3 Connect the positive lead of the voltmeter to A1TP3 on the HP 1652B or A1TP2 on the HP 1653B System Board Assembly 4 Connect the power cord to HP 1652B 1653B and turn on the instrument 5 Assign pod 3 of the HP 1652B or pod 2 of the HP 1653B to a machine in the System Configuration menu by using front panel knob and SELECT key 6 Press the CHAN FORMAT key and set the User defined pod threshold of the pod assigned in the previous step to 9 9 V Refer to the following steps if you are unfamiliar with menus a Move cursor to the pod threshold field TTL with the front panel knob and press SELECT b Move the curs
33. attenuator or the oscilloscope assembly HP 1652B 1653B Performance Tests Service Manual 3 41 DC Offset Description Accuracy Test This test verifies the DC offset accuracy of the instrument Specification 2 mV 2 of channel offset 2 5 of full scale Equipment Required Digital Voltmeter oooo oo oo HP 3478A Power Supply 20000 cece eee eee HP 6114A BING Gable MEER CL TT eee HP 10503A BNC f to Banana m Adapter HP 1251 2277 Banana m to Banana m Cable HP 11000 60001 Procedure 1 Connect the HP 1652B 1653B and test equipment as in figure 3 50 LOGIC ANALYZER MULTIMETER 01652E 14 Figure 3 50 Setup for DC Offset Accuracy 2 In the System Configuration menu turn both State Timing Analyzers off unassign all of the pods from the analyzers and turn the oscilloscope on as in the previous test figure 3 44 3 Press the FORMAT CHAN key and turn on channel 1 by inserting the channel 1 waveform Then turn off channel 2 by deleting the channel 2 waveform 4 Using the knob and SELECT key set Input to CH 1 Probe to 1 1 and Impedance to 1 MOhm as in the previous test figure 3 46 Performance Tests HP 1652B 1653B 3 42 Service Manual 5 Press the TRACE TRIG key and set the Mode to Immediate and the Run mode to Repetitive as in figure 3 51 tao Mode Run mode s Div Delay armed oy Run Figure 3 51 Trigger Menu 6 Pr
34. channels up to eight at one time The test connector consists of a BNC connector and a 2 by 8 Berg connector The Hewlett Packard part number for the BNC connector in figure 3 2 is 1250 1032 and the Hewlett Packard part number for the 2 by 8 Berg connector is 1252 1816 Equivalent parts may be used in place of the Hewlett Packard parts JUMPER WIRE GRAY PR SIGNAL LEAD 222 ZB ZZ GROUND PROBE 53 S RG S CONNECTOR BNC BULKHEAD CONNECTOR O1652E 10 Figure 3 2 Test Connector Using Berg Connector Performance Tests 3 5 Clock Qualifier Description ta Input ana iaia gt This test verifies the setup and hold times for the falling edge of the HP 1652B L clock specification and the falling edge of the HP 1653B J and K clock specification This test also verifies the maximum clock rate with counting mode On Specification Clock repetition rate With time or state counting mode on minimum time between states 1s 60 ns Setup time Data must be present prior to the clock transition 10 ns HP 1652B hold time Data must be present after the falling edge of the L clock transition O ns HP 1653B hold time Data must be present after the falling edge of the J and K clock transition 0 ns Equipment Required Pulse Generator o o oooooooo o HP 8161A 020 Oscilloscope imac ou RI dot res HP 54502A 50 Ohm Feedthrough 2 HP 10100C Test Connector 2 veimoarians isla
35. for Data Test 6 HP 1652B 1653B Performance Tests Service Manual 3 25 a Move the cursor to the Pod Clock field press SELECT and assign Demultiplex b Move the cursor to the clock fields and assign the falling clock transition of the J clock to the Master Clock and the rising J clock transition to the Slave Clock c Move the cursor to the appropriate bit field and assign ALL channels to the pod under test only bits 0 through 7 are available for assignment d Move the cursor to the Clock Period and set it to 60 ns 5 Set the State Trace Specification without sequencing levels and set Count Off as in the previous figure 3 14 6 Press RUN The State Listing shows alternating Fs and Os for the po under test as in figure 3 29 MACHINE State Listing Markers Off Lebel gt POD Base gt 40000 0000 40001 FFFF 40002 0000 FFFF 0000 FFEF 0000 FFFF 0000 FFFF 0000 FFFF 0000 FFFF 0000 FFFF Figure 3 29 State Listing for Data Test 6 il To ensure a consistent pattern of alternating Fs and 0s use the front panel ROLL Note E field and knob to scroll through the State Listing 7 Connect the next clock to the test connector and repeat steps 4 and 6 8 Repeat steps 4 6 and 7 until all clocks have been tested clocks J K L M and N 9 Remove the probe tip assembly from the logic analyzer probe cable and attach it to the next logic analyzer probe cable to be tested Take care not to dislo
36. from the DAC Theory of Operation 6A 9 The trigger circuitry output drives the time base and the logic analyzer arming input This output and internal status signals are interfaced to the data bus for software processing purposes Time Base The time base provides the sample clocks and timing necessary for data acquisition It consists of the 400 MHz reference oscillator mux sync hybrid multiplexer synchronizer and time base IC The mux sync hybrid provides sample clocks to the ADC At sample rates of 400 MHz and 200 MHz this sample clock is derived from the 400 MHz reference oscillator At 100 MHz and slower the sample clock comes from the time base IC The mux sync hybrid synchronizes the gating of the sample clock to provide only full sample clocks The time base hybrid has programmable dividers to provide the rest of the sample frequencies appropriate for the time range selected It uses the time stretched output of the fine interpolator to time reference the sampling to the trigger point It has counters to control how much data is taken before pre trigger data and after post trigger data the trigger event After the desired number of pre trigger samples has occurred the time base hybrid sends a signal to the Logic Trigger trigger arm indicating it is ready for the trigger event When the trigger condition is satisfied the Logic Trigger sends a signal back to the time base hybrid The time base hybrid then starts the post tri
37. its bandwidth specification This procedure should not be performed as part of the routine adjustments Typically it needs to be done only when the instrument fails the bandwidth performance test an attenuator has been changed or the oscilloscope assembly has been changed new combination of attenuators and PC board Only the channel s involved with the failure or repair should be adjusted Equipment Required Pulse Generator Picosecond Pulse Labs 2700C BNC Cable iiir v ER HP 10503A Procedures 1 Turn off the HP 1652B 1653B and disconnect the power cord Then remove the top cover 2 Connect the power cord to the HP 1652B 1653B and turn on the instrument 3 Set the pulse generator for pulse output Attenuate the signals from the Picosecond Pulse Labs generator by at least 20 dB Setting the attenuation from 0 dB to 20 dB may result in damage to the HP 1652B 1653B attenuators 4 In the System Configuration menu turn both State Timing analyzers Off and turn the oscilloscope On 5 Press FORMAT CHAN and set V Div to 100 mV Offset to 150 mV Probe to 1 1 Impedance to 50 Ohms and s Div to 5 ns 6 Press TRACE TRIG and set the Run mode to Repetitive 7 Press DISPLAY and set Display to Normal Connect dots On and Grid On 8 Connect the pulse generator to the channel 1 input of the HP 1652B 1653B oscilloscope and press RUN 9 Press TRACE TRIG and adjust the trigger Level for a stabl
38. measured with reference to the respective ground CRT Monitor 1 Remove the instrument top cover Signals Check T l TENE 9 E 2 Check the CRT Monitor input cable for the signals and supplies listed in the table below The cable is the wide ribbon cable connecting the monitor assembly to the System Assembly Board 3 Dynamic video signals FB Full bright and HB Half bright are TTL inputs Check for activity on these lines The table includes a truth table for these signals Table 6C 1 CRT Monitor Input Cable Pin Assignments PIN SIGNAL PIN SIGNAL HP 1652B 1653B Service Manual 5 V Digital GROUND Display 12 V Display 12 V Display 12 V Display VSYNC GROUND Digital GROUND Display GROUND Display GROUND Display 12 V Display GROUND Display GROUND Display GROUND Display HSYNC 12 V Display GROUND Digital FB Full bright HB Half bright 5 V Digital Troubleshooting Keyboard Signals Isolate a faulty elastomeric keypad or keyboard when the random key s are not Check operating by performing the following steps 1 Za Turn off the instrument and remove the power cable Without disconnecting the keyboard cable follow the keyboard removal procedure to loosen the keyboard Leave the keyboard in place in front of the instrument Reconnect the power cable and turn on the instrument Run the Keyboard Self Test and press all of the keys Allow the keyboard asse
39. mode repeats single mode acquisitions until stop is pressed or until the time interval between two specified patterns is less than or greater than a specified value or within or not within a specified range There is only one trace mode when two analyzers are on Labels Channels may be grouped together and given up to a six character name Up to 20 labels in each analyzer may be assigned with up to 32 channels per label The primary use is for naming groups of channels such as address data and control busses HP 1652B 1653B Service Manual HP 1652B 1653B Service Manual Indicators Activity Indicators Provided in the Configuration State Format and Timing Format menus for identifying high low or changing states on the inputs Markers Two markers X and 0 are shown as dashed lines on the display Trigger The trigger is displayed as a vertical dashed line in the timing waveform display and as line 0 in the state listing display Marker Functions Time Interval The X and 0 markers measure the time interval between one point on a timing waveform and trigger two points on the same timing waveform two points on different waveforms or two states time tagging on Delta States State Analyzer Only The X and 0 markers measure the number of tagged states between one state and trigger or between two states Patterns The X and 0 markers can be used to locate the nth occurrence of a specified pattern before or after trigger
40. osi 5 air eae ra NR eus 1 15 Vertical nae ecce daa os becas esee LO au 1 15 Honzontal edt io daten son teed oe ietedsE nau bes dati fav ue 1 15 A A mug ne peau du tin ae C DE RE Ee Cate 1 15 Oscilloscope Operating Characteristics 0022s eee e ee eee teens 1 15 Vertical at BNC 252m rud lA 1 15 HOZ NA A 1 16 A hr EvDPBOPMa dde tA ES sees DUNG petant DE EUN 1 17 Waveform Display sese saputo AAA d du d 1 17 Measurement AIdS i020 oo eve EUR A p dedu ga 1 18 Interactive Measurements ec yersreci e rere ERRORES MERE cee Stewie 1 19 JA CQUISIHOD co oorr deme Se ood abge aae tarda Pb dun 1 19 Mixed Displays taba ide iodo Dod dnd 1 19 Time Come id AAA 1 19 Time Interval Accuracy between Modules oooooococcoocmnom 1 19 General Characterisi s voii a di ia 1 19 Operatine Environment np Ad A 1 19 Power Requirements taloneras aSrAS 1 20 gg nnn 1 20 DIMENSIONS derretida Medie da dud 1 20 Recommended Test Equipment o ooocooocnocorroncconor I 1 21 A 0 Section 2 HP 1652B 1653B Service Manual Installation Introduction sota raid 2 1 Safety Considerations sisas rd 2 1 Dual inspeccion idas AO ala 2 1 Operating Disk Installation ce eee eee een eens 2 1 Power REQUIEM eoo rece cee detache sa eee 2 1 Line Voltage Selection 2 225 053 oves 0 eR ed docebo EIU PU eae mi edd 2 2 Power Cable cuida we ven dote rhet us tonat is iei pi edis 2 3 Applying POWer
41. pulse generator OSCILLOSCOPE PULSE GENERATOR LOGIC ANALYZER oma o om u 01650849 Figure 3 19 Setup for Data Test 4 ull In this setup only eight channels are tested at one time to minimize loading The Not P ground lead must be connected to ensure accurate test results It is recommended that all eight channel grounds be connected Performance Tests HP 1652B 1653B 3 18 Service Manual 2 Adjust the pulse generator for the output in figure 3 20 28 5NS gt E 1 9V TENS 1 6V CLOCK OUTPUT B aig ren NON H 57NS gt 1 9V zons m 1 6V DATA OUTPUT A 1 8V 01650W13 Figure 3 20 Waveform for Data Test 4 Setting for HP 8161A Parameter Output A Output B Input Mode Norm Period PER mE HP 1652B 57 ns HP 1653B 80 ns Width WID 20 ns 10 ns Leading Edge LEE 1ns 1ns Trailing Edge TRE 1 ns 1 ns High Level HIL 1 9V 1 9V see Note Low Level LOL 1 3V 1 3V see Note Delay DEL HP 1652B 18 5 ns 0 ns HP 1653B 30 ns 0 ns Double Pulse DBL HP 1652B 28 5 ns HP 1653B 40 ns Output Mode ENABLE ENABLE uil The voltage levels of the waveforms must have the correct amplitude at the logic Note P analyzer probe tips The pulse generator output may have to be increased slightly to compensate for loading by the logic analyzer 3 Assign the pod under test to Analyzer 1 in the System Configuration as in the previous figure 3 5
42. range term is available and is assigned to the first state analyzer turned on The maximum size is 32 bits and on a maximum of 2 pods HP 1652B 1653B Service Manual HP 1652B 1653B Service Manual Qualifier A user specified term that can be anystate nostate a single pattern recognizer range recognizer or logical combination of pattern and range recognizers Sequence Levels There are eight levels available to determine the sequence of events required for trigger The trigger term can occur anywhere in the first seven sequence levels Branching Each sequence level has a branching qualifier When satisfied the analyzer will restart the sequence or branch to another sequence level Occurrence Counter Sequence qualifier may be specified to occur up to 65535 times before advancing to the next level Storage Qualification Each sequence level has a storage qualifier that specifies the states that are to be stored Enable Disable Defines a window of post trigger storage States stored in this window can be qualified Prestore Stores two qualified states that precede states that are stored Tagging State Tagging Counts the number of qualified states between each stored state A measurement can be shown relative to the previous state or relative to trigger Maximum count is 4 4 X 10 to the 12th power Time Tagging Measures the time between stored states relative to either the previous state or to the trigger Maximum t
43. storing any state Trigger on e t imes Store eny state Armed by Branches orr Count off Prestore Off Figure 3 14 Trace Specification for Data Test 2 6 Press RUN The State Listing is displayed and lists all Os for the channels under test as in figure 3 15 MACHINE 1 State Listing Markers 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 Figure 3 15 State Listing for Data Test 2 To ensure a consistent pattern of Os in the listing use the front panel ROLL field and knob to scroll through the State Listing Performance Tests 3 13 7 Connect the next clock to the test connector and repeat steps 4 and 6 for the appropriate clock Repeat these steps until all clocks have been tested clocks J K L M and N 8 Remove the probe tip assembly from the logic analyzer probe cable and attach it to the next logic analyzer probe cable to be tested Take care not to dislodge grabbers from the test connector 9 Repeat steps 3 4 6 and 7 until the lower bits of all pods pods 1 through 5 have been tested with all clocks 10 Disconnect the lower eight bits bits 0 through 7 from the test connector Attach the upper eight bits bits 8 through 15 to the test connector and repeat steps 3 4 6 7 and 8 until the upper bits of all pods pods 1 through 5 have been tested with all clocks Performance Tests HP 1652B 1653B 3 14 Service Manual Clock Qualifier Description
44. test failure 1s caused by a defective attenuator or oscilloscope Note assembly HP 1652B 1653B Service Manual Performance Tests 3 53 Table 3 1 Performance Test Record Hewlett Packard Tested by Model 1652B 1653B Logic Analyzer Work Order No Serial Date Tested Number Recommended Calibration Interval 24 Months Do Tet Po Rei Clock Qualifier and Data Inputs Test 1 Clock Qualifier and Data Inputs Test 2 Clock Qualifier and Data Inputs Test 3 HP 1652B Only Clock Qualifier and Data Inputs Test 4 Clock Qualifier and Data Inputs Test 5 Performance Tests HP 1652B 1653B 3 54 Service Manual Table 3 1 Performance Test Record continued Clock Qualifier and Data Inputs Test 6 Glitch Test Threshold Accuracy Test HP 1652B 1653B Performance Tests Service Manual 3 55 Table 3 1 Performance Test Record continued tet tits A Voltage Measurement Accuracy Test 10 0 V 31 758 38 242 V 5 0 V 15 878 19 122 V 20 V 6 935 7 065 V 3 174 3 826 V 1 586 1 914 V 200 mV 633 2 766 8 mV 100 mV 315 6 384 4 mV 156 8 193 2 mV 61 52 78 48 mV 43 14 56 86 mV DC Offset Accuracy Test 19 50 20 50 V 9 758 10 242 V 4 878 5 122 V 1 948 2 052 V Bandwidth Test Down lt 3dB at 100 MHz Time Measurement 9 4 to 10 6 ns Accuracy 100 ns 99 4 to 100 6 ns Test 500 ns 499 4 to 500 6 ns 1 us 989 5 to 1 01
45. the instrument cabinet can cause poor operation or malfunction Protection should be provided against temperature extremes which cause condensation within the instrument The HP 1652B 1653B will operate at all specifications within the temperature and humidity range given in section 1 of this manual Storage and Shipment The instrument may be stored or shipped in environments within the following limits Temperature 40 C to 75 C Humidity Up to 90 at 65 C Altitude Up to 15 300 meters 50 000 feet eee uadit Tagging for Service If the instrument is to be shipped to a Hewlett Packard office for service or repair attach a tag to the instrument identifying the owner address of the owner complete instrument model and serial numbers and a description of the service required OO eee Original Packaging HP 1652B 1653B Service Manual If the original packaging material is unavailable or unserviceable materials identical to those used in factory packaging are available through Hewlett Packard offices If the instrument is to be shipped to a Hewlett Packard office for service attach a tag identifying the owner address of the owner complete instrument model and serial numbers and a description of the service required Mark the container FRAGILE to ensure careful handling In any correspondence refer to the instrument by model number and full serial number Installation 2 9 3
46. the two screws from each side of the Assemb y instrument s top cover Lift off the top cover Disconnect the line filter cable from the power supply Disconnect the ground cable of the line filter from the oscilloscope assembly aI OQ tA A Disconnect the Intensity adjust cable from the rear of the high voltage sweep board 00 Remove the eight screws at the edges of the rear panel 9 Pull the rear panel straight out from the instrument about three inches E An ESD ground spring clip is installed on the RS 232C connector behind the rear af Note ae panel This ground spring clip is not mechanically secured to the instrument Make sure the ground spring clip does not fall off during disassembly 10 Remove the two screws holding the HP IB ribbon cable connector to the rear panel 11 Disconnect the External Trigger Input cable from connector J9 on the Main Assembly 12 Disconnect the External Trigger Output cable from connector J10 on the Main Assembly 13 Disconnect the Probe Compensation cable from the oscilloscope board 14 Disconnect the fan cable from the Main Assembly 15 Separate the rear panel from the instrument cabinet 16 Replace the rear panel by reversing this procedure il When you reinstall the top cover insert the four screws on the sides of the cover Note iP first while making sure the cover fits into the grooves of the instrument cabinet Then insert the six screws in the top of the cover
47. to transmit data in coded messages These messages are used to program the instrument function transfer measurement data and coordinate instrument operation Input and output of all messages in bit parallel byte serial form are also transferred on the data lines A 7 bit ASCII code normally represents each piece of data Data is transferred by means of an interlocking Handshake technique which permits data transfer asynchronously at the rate of the slowest active device used in that transfer The data byte control lines coordinate the handshaking and form the second functional group The remaining five general interface management lines third functional group are used to manage the devices connected to the HP IB This includes activating all connected devices at once clearing the interface and other operations The connections to the HP IB connector on the rear panel are shown in figure 2 3 HP 1652B 1653B Installation Service Manual 2 5 DIO5 DIOS 0107 DIO8 REN P O TWISTED PAIR WITH 6 P O TWISTED PAIR WITH 7 P O TWISTED PAIR WITH 8 SHOULD BE GROUNDED P O TWISTED PAIR WITH 9 OTHER WIRE OF TWISTED PAIR P O TWISTED PAIR WITH 10 P O TWISTED PAIR WITH 11 SIGNAL GROUND DI91 DIO2 DIOS DIO4 EOI DAV NRFD NDAC IFC BCL SRQ ATN MRE SHIELD 01652t05 TYPE 57 MICRORIBBON CONNECTOR Figure 2 3 HP IB Interface Connector eee HP IB Address Each instrument connected to the HP IB interf
48. 0 us 1 990 to 2 010 us Trigger Sensitivity Test 2 V div 0 4 div at 1 MHz 0 4 div at 100 MHz 200 mV div 0 4 div at 1 MHz 0 4 div at 100 MHz 20mV div 0 4 div at 1 MHz 0 4 div at 100 MHz Performance Tests HP 1652B 1653B 3 56 Service Manual Contents Section 4 Adjustments and Calibration INTO ducto 4 1 Equipment Required 2225 obo iuuboiRi phe E Kid PEINE Lebe redu 4 1 Adjustments and Calibration Interval 0 0 cece eee eee eens 4 1 Safety Requiremefits pa UR eet eU nU Esc TEAM rd uds 4 2 Instrument War up c reet actin od nie da 4 2 Adusien MM M ieee tate hae Gia ew ETT 4 2 Calibratloit A PO O 4 2 Power Supply Assembly Adjustment 0 ccc cece cece cette eee eeeee 4 3 CRT Monitor Assembly Adjustments 0 cece cece cece cee ee ees 4 4 Intensity Sub Bright and Contrast Adjustment 4 4 Focus Adjustment A ARE PRA a heat v 4 5 Horizontal Phase Vertical Linearity and Height Adjustments 4 5 System Board Assembly Threshold Adjustment oooooomomooo 4 6 Oscilloscope Assembly High Frequency Pulse Adjustment 4 9 Software Calibration sia deis 4 11 Offset Calibration salsa 4 12 Attenuator Calibration ioi node de Coe UD eS e edd ts 4 12 Gain Calibration n PEE 4 13 Truecer aliDEAtIOT A orn rta pra e d a pd a eae Pn 4 13 Delav CallDFAlOl c oos eut pa eb tac Eor E UE DIDI de REVENUS idet 4 13 4 Adjustm
49. 1 and press SELECT b Set the analyzer Type to State using the cursor and the SELECT key c Move the cursor to the Pod to be tested and assign it to Machine 1 HP 1652B 1653B f Performance Tests Service Manual 3 7 4 In the State Format Specification assign the Clock Period to 7 60 ns Also assign the lower 8 channels of the pod under test to a label as shown in figure 3 6 If you are testing the HP 1652B assign the falling edge of the L clock for all pods If you are testing the HP 1653B assign the falling edge of the J clock for all pods Refer to steps a through c if you are unfamiliar with the menus MACHINE j State Format Specification Specify Symbols Clock Clock Period Pod 1 Activity gt 12221212 Lebel Po 1l5 87 O Figure 3 6 Format Specification for Data Test 1 a Press the front panel FORMAT CHAN key b Move the cursor to Clock field Then use the cursor and SELECT key to assign the falling edge of the appropriate clock as in figure 3 7 MACHINE j State Format Specification Specify Symbols Clock Clock Period Pod 1 60 ns Y Ld Specify Clock Activity gt Lebel Pol I5 Ly CO GO GO Figure 3 7 Clock Assignment for Data Test 1 Performance Tests HP 1652B 1653B 3 8 Service Manual c Move the cursor to the bit assignment field and turn on the appropriate eight bits to be tested on off as in figure 3 8 Specify Symbols Clock Period Pod 1 Activity
50. 1 or 2 Auto Trigger Self triggers if no trigger condition 1s found within approximately 1 second after arming Trigger Out Arms Analyzer 1 or 2 or triggers the rear panel BNC Display Formats 1 to 8 oscilloscope waveforms can be displayed Display Resolution 500 points horizontally 240 points vertically Display Modes Normal New acquisitions replace old acquisitions on screen Accumulate New acquisitions are added to the screen and displayed with the previous acquisitions until a parameter is changed and a new acquisition is made Average New acquisitions are averaged with older acquisitions and displayed The maximum number of averages is 256 General Information 1 17 Measurement Aids General Information 1 18 Overlay Channels 1 and 2 can be overlayed in the same display area Connect the dots Provides a display of the sample points which are connected by straight lines Waveform Reconstruction A reconstruction filter fills in the missing data points when the timebase is set to lt 100 ns division or when the timebase setting is reduced to a point where there are fewer than 500 data samples on the screen Waveform Math Display capability of A B B A and A B functions is provided Mixed Mode Oscilloscope plus logic analyzer displays on the same screen Time Markers Two vertical markers labeled X and O Voltage levels are displayed for each marker Time interval measurements can be made between any tw
51. 1s compatible with RS 232 C protocol When a hardwire handshake method is used the Data Terminal Ready DTR line pin 20 on the Computer Modem connector is used to signal whether space is available for more data in the logical I O buffer Pin outs of the RS 232 C connectors are listed 1n table 2 2 nM EMEN a RS 232 C At power up the RS 232 C interface is configured as shown in figure 2 5 To Co nfig uration change the RS 232 C configuration 1 Press the I O key on the front panel keypad and the I O menu will appear on screen 2 Rotate the KNOB until I O Port Configuration is highlighted 3 Touch the SELECT key and the External I O Port Configuration menu will appear on screen External I 0 Port Configuration Printer connected to RS 232 C Controller connected to HP IB RS 232 C Configuration HPIB Configuration Protocol XON XOFF HPIB Address Stop Bits 1 Perity Baud rate 9600 Data Bits 8 Psinter Information Printer Paper width Figure 2 5 External I O Port Configuration Menu 4 Using the KNOB and SELECT key configure the RS 232 C interface as desired 5 Select the DONE field in the upper right corner of the menu using the KNOB and SELECT key to exit the External I O Port Configuration menu HP 1652B 1653B Installation Service Manual 2 7 Pin No 20 23 Installation 2 8 Table 2 2 RS 232 C Signal Definitions Function Protective Ground Transmitted Data TD
52. 27 2 Adjust the pulse generator for the output in figure 3 31 20NS L4 ONS lt DATA OUTPUT A veg UN amor AN 0165015 Figure 3 31 Waveform for Glitch Test Setting for HP 8161A Parameter Output A Output B Input Mode Norm Period PER 20 ns Width WID 5 ns Leading Edge LEE ins Trailing Edge TRE 1 ns High Level HIL 3 2 V Low Level LOL OV Delay DEL 0 ns Output Mode ENABLE 3 Assign the pod under test to Analyzer 1 in the System Configuration as in figure 3 32 Refer to steps a through c if you are unfamiliar with menus System Configuration Analyzer 1 Analyzer 2 Oscilloscope Neme MACHINE 1 Type timing Type orf 1 Unassigned Analyzer Figure 3 32 System Configuration for Glitch Test a Move the cursor to the Type field of Analyzer 1 and press SELECT b Set the analyzer Type to Timing using the cursor and SELECT key c Move the cursor to the pod to be tested and assign it to Machine 1 Analyzer 1 Performance Tests HP 1652B 1653B 3 28 Service Manual 4 In State Format Specification assign the lower eight bits of the pod under test to a label as shown in figure 3 33 Make sure the appropriate eight bits in the bit assignment field are turned on MACHINE Timing Format Specification Specify Symbols Activity gt Label Pol 15 caia Figure 3 33 Glitch Test Timing Format Specification 5 Set Timing Trace Specifica
53. 4 4 Focus Adjustment 522g cx mo ober eterne A hese wee D pde uc deu Rs 4 5 Horizontal Phase Vertical Linearity and Height Adjustments 4 5 System Board Assembly Threshold Adjustment 4 6 Oscilloscope Assembly High Frequency Pulse Adjustment 4 9 Software Calibrauon queas ei radio eru dob 4 11 HP 1652B 1653B Service Manual Offset Calibration iria dia iii 4 12 Attenuator Calibration 543509 xa et do 4 12 Gain CalibEAUOH vri cere eR EV LA SEO DUC po ER 4 13 Trigger Calibration i52 bins o tsa won nds 4 13 Delay Calibration oio Caution t baud ed pit dd ia daa 4 13 o Section 5 Section 6A Section 6B Replaceable Parts Intro ducho conidios 5 1 ADDTEVIALIONS cas od 5 1 Replaceable Pai id aa 5 1 Exchange ASSemblies cutre aa 5 1 Ordering Informati n ooo edu E oov tease ia 5 2 Direct Mail Order System soe 5 2 NENNEN Theory of Operation Introductiofi 444042 susieheak aes I RA e T acd ERE ud ed eius 6A 1 Safely sacos seu schen dec UN M LL ES dose ei D IL EE 6A 1 Block Level Theoty seco nce coed ESL VERAT CE rani n EE RES 6A 1 Power Supply Assembly 2 2x peu ds dete 6A 4 CRT Monitor Assembly TETTE CHEN 6A 4 Mail Assembly ri Db nar Cae M ND PME REV dpi aedis 6A 4 Central Processing Unit CPU usina 6A 4 Oscilloscope AssemDIy ci dou EE Seu ape E NIU UC su died 6A 4 Keypad and Knob Assembly 2 0 cece cece cece e ence eeneees 6A 5 Disk Control
54. 4301 MP8 01652 40501 6 1 KEYBOARD HOUSING 28480 01652 40501 MP9 01652 41901 2 1 ELASTOMERIC KEYPAD 28480 01652 41901 MP10 01652 40502 7 1 KEYBOARD SPACER 28480 01652 40502 MP11 01650 46101 2 2 LOCKING PIN PCB 28480 01650 46101 MP12 01650 00205 1 1 REAR PANEL 1652B 28480 01650 00205 MP12 01651 00203 0 1 REAR PANEL 1653B 28480 01651 00203 MP13 7120 4835 0 1 CSA CERTIFICATION LABEL 28480 7120 4835 MP14 01650 04101 4 1 TOP COVER 28480 01650 04101 MP15 01650 84501 6 1 ACCESSORY POUCH 28480 01650 84501 MP16 01650 94303 7 1 PROBE LABELS 28480 01650 94303 MP17 01650 29101 6 5 GROUND SPRING SYSTEM BOARD 1652B 28480 01650 29101 MP17 01650 29101 6 2 GROUND SPRING SYSTEM BOARD 1653B 28480 01650 29101 MP18 01650 29102 7 1 CLIP RS 232 ESD 28480 01650 29102 MP19 01650 25401 1 1 DISK INSULATOR 28480 01650 25401 MP20 01650 63202 0 1 RS 232 LOOPBACK CONNECTOR 28480 01650 63202 MP21 01650 47401 7 1 RPG KNOB 28480 01650 47401 MP22 01652 01201 1 1 BRACKET PC BD OSCILLOSCOPE BOARD 28480 01652 01201 MP23 01652 01202 2 1 PLATE PC BD OSCILLOSCOPE BOARD 28480 01652 01202 MP24 01652 94303 9 1 PROBE COMPENSATION LABEL 28480 01652 94303 W1 01650 61601 9 1 SWEEP CABLE 28480 01650 61601 W2 54503 61606 7 1 POWER SUPPLY CABLE 28480 54503 61606 W3 01650 61604 2 1 DISK CABLE 28480 01650 61604 WA 01650 61605 3 2 BNC CABLE 28480 01650 61605 W5 01650 61607 5 5 PROBE CABLE 1652B 28480 01650 61607 W5 01650 61607 5 2 PROBE CABLE 1653B 28480 01650 61607 W6 01650 61613 3 1
55. 52B 1653B Performance Tests Service Manual 3 1 Power up Self Test The power up self test is automatically invoked at power up of the Selectable Self Tests Performance Tests 3 2 HP 1652B 1653B Logic Analyzer The revision number of the operating system firmware is given in the upper right of the screen during the power up self test As each test is completed either passed or failed will be printed in front of the name of the test in this manner PERFORMING POWER UP SELF TESTS passed ROM test passed RAM test passed Interrupt test passed Display test passed Keyboard test passed Acquisition test passed Threshold test passed Disk test LOADING SYSTEM FILE As indicated by the last message the HP 1652B 1653B will automatically load from the operating system disk in the disk drive If the operating system disk is not in the disk drive the message SYSTEM DISK NOT FOUND will be displayed at the bottom of the screen and NO DISK will be displayed in front of disk test in place of passed If the message SYSTEM DISK NOT FOUND appears on screen insert the operating system disk into the disk drive and press any front panel key Eight self tests may be invoked individually via the Self Test menu The eight selectable self tests are Analyzer Data Acquisition Scope Data Acquisition RS 232 C BNC Keyboard RAM ROM Disk Drive Cycle through tests After entering the I O Self Tests menu the required test is select
56. 6 1 914 V 633 2 766 8 mV 315 6 384 4 mV 156 8 193 2 mV 61 52 78 48 mV 43 14 56 86 mV 10 Set the power supply to the voltage listed on the first line of the previous table HP 1652B 1653B Service Manual 11 Press the TRACE TRIG key then press RUN The Trigger level cursor will appear as in figure 3 49 Scope Trigger Calibration Mode Run mode jRepetitive s D1v Deley Armed by Run Figure 3 49 Trigger Menu 12 After the display has time to settle observe the X and O cursor voltage display Verify that these voltages are within the limits in the previous table and press STOP 13 Repeat steps 9 through 12 for each line of the table 14 Press the FORMAT CHAN key and turn on channel 2 by inserting a waveform on the display Refer to steps a through c if you are unfamiliar with menus a Move the cursor to CH 1 at the left side of the display and press SELECT b Move the cursor to Insert waveform and press SELECT c Move the cursor to CH 2 and press SELECT 15 Turn off channel 1 by deleting the channel 1 waveform 16 Set Input to CH 2 and connect the power supply to Channel 2 17 Repeat steps 6 through 13 for channel 2 d Voltage measurement errors can be caused by the need for self calibration Note P Perform the Offset Calibration and Gain Calibration see Adjustments section 4 before troubleshooting the instrument If self calibration fails to correct the problem the cause may be the
57. 65 C 149 F Disk Media 8 to 80 relative humidity at 40 C 104 F Altitude Operating Up to 4600 meters 15 000 ft Non operating Up to 15 300 meters 50 000 ft Vibration Operating Random vibration 5 to 500 Hz 10 minutes per axis 0 3 g rms Non operating Random vibration 5 to 500 Hz 10 minutes per axis 2 41 g rms Resonant search 5 to 500 Hz swept sine 1 Octave minute sweep rate 0 75 g 0 peak 5 minute resonant dwell at 4 resonances per axis Power Requirements 115 230 Vac 25 to 15 48 to 66 Hz 200 W max Weight 10 0 kg 22 lbs net weight 18 6 kg 41 lbs shipping weight Dimensions _ Refer to the outline drawing below 1 Dimensions are for general information only If dimensions are required for building special enclosures contact your HP field engineer 2 Dimensions are in millimetres and inches his m MEN 362 5 14 3 16 62 e 955 6 14 0 194 3 7 65 54501E13 EN 16 75 Figure 1 1 HP 1652B 1653B Dimensions General Information HP 1652B 1653B 1 20 Service Manual eee Recommended Test Equipment Table 1 1 lists the test equipment required to test performance make adjustments and troubleshoot the HP 1652B 1653B Logic Analyzer The table includes the critical specifications of the test equipment and lists each procedure in which the equipment is required Other equipment may be substituted if it meets or exceeds the critical spec
58. 9 Figure 3 22 Setup for Data Test 5 ucl In this setup only eight channels are tested at one time to minimize loading The Note a ground lead must be connected to ensure accurate test results HP 1652B 1653B Performance Tests Service Manual 3 21 2 Adjust the pulse generator for the output in figure 3 23 u 6ONS 3 2V tons CLOCK OUTPUT B eV La 12 NS M p eem DATA OUTPUT A QV 40NS h 60NS P 4 20NS O1650w14 Figure 3 23 Waveform for Data Test 5 Setting for HP 8161A Parameter Output A Output B Input Mode Norm Period PER 120 ns Width WID 60 ns 10 ns Leading Edge LEE 1ns 1ns Trailing Edge TRE 1 ns 1 ns High Level HIL 3 2 V 3 2V Low Level LOL OV OV Delay DEL 40 ns Ons Double Pulse DBL 60 ns Output Mode ENABLE ENABLE 3 Assign the pod under test to Analyzer 1 in the System Configuration as in the previous figure 3 5 4 Set up the State Format Specification as in figure 3 24 Assign the falling J clock to the Master Clock and the rising J clock to the Slave Clock Refer to steps a through d after figure 3 24 if you are unfamiliar with menus MACHINE j State Format Specification Specify Symbols Master Clock Slave Clock J4 Activity gt t212 1212 Ledel Pol 15 87 0 Figure 3 24 Format Specification for Data Test 5 Performance Tests HP 1652B 1653B 3 22 S
59. B 4 10 Service Manual CTO SETS 01652E 17 Figure 4 6 High Frequency Pulse Adjustments Software Software Calibration is accessed through the Trigger menu of the oscilloscope Calibration The calibration procedures in this section should be followed in their entirety and in the same sequence shown An instrument warm up of 15 minutes is recommended before starting these Note procedures HP 1652B 1653B Adjustments and Calibration Service Manual 4 11 Offset Calibration 1 In the System Configuration menu turn both State Timing analyzers Off and turn the oscilloscope On 2 Press TRACE TRIG and select Calibration using the front panel knob and SELECT key ucl Offset should be listed as the default Calibration choice If not select the Note wl Calibration choice field and when the pop up appears select Offset 3 Select Start with the front panel knob and SELECT key ui To abort the Offset calibration select Cancel using the front panel knob and Note SELECT key 4 Disconnect all signals from the channel 1 and 2 inputs of the HP 1652B 1653B oscilloscope Then select Continue using the front panel knob and SELECT key to proceed with the calibration A message will appear on screen to indicate the instrument is performing the calibration 5 When the calibration is complete the updated calibration status appears on screen and the instrument remains in the Calibration menu Attenuator Equipment Requir
60. Clock Qualifier and Data Inputs Test 3 HP 1652B Only 3 15 Clock Qualifier and Data Inputs Test 4 ooooooooommomo 3 18 Clock Qualifier and Data Inputs Test 5 ooooooomomoommo m o 3 21 Clock Qualifier and Data Inputs Test 6 0 cece cece eee ee eee 3 24 Gittch Test RE Tm 3 27 Threshold Accuracy Vest rat 3 31 Oscilloscope Performance Tests 2 eee cece cece eee e tence no 3 35 Input R sistance Test oss ovo E RERUM PIE peed yes Rein wee ie 3 35 Voltage Measurement Accuracy Test ooooooooocccrrommmom 3 37 DC Ollsct Accuracy Lestat 3 42 Bandwidth Test sieves peers ii AR 3 45 Time Measurement Accuracy Test 0 cece eee ce ee ee ence 3 48 Tigger SENSIIVILY ECSE censo uuo ne Ri tasa 3 51 A eee Section 4 Contents 2 Adjustments and Calibration Introducir eateheat Bt meieswuaeesieeeheeyos ss cite ds 4 1 Equipment Required ceo eo tre thee ME V ewes tartara de ioa i d 4 1 Adjustments and Calibration Interval cece cece etree ees 4 1 Salety Requirements AS e ME se ees 4 2 Instrument Warmup onse cotes EE UE DAT WR I UMOR RU ddr as 4 2 A ovid pu Sa d a etes mutui did oso e udi edis 4 2 CCAlib AUOlE sesos 4 2 Power Supply Assembly Adjustment 0 2 cece eee ee ee ee ee eese 4 3 CRT Monitor Assembly Adjustments cece cece cece eee eens 4 4 Intensity Sub Bright and Contrast Adjustment u
61. HP shall pay shipping charges to return the product to Buyer However Buyer shall pay all shipping charges duties and taxes for products returned to HP from another country HP warrants that its software and firmware designated by HP for use with an instrument will execute its programming instructions when properly installed on that instrument HP does not warrant that the operation of the instrument or software or firmware will be uninterrupted or error free LIMITATION OF WARRANTY The foregoing warranty shall not apply to defects resulting from improper or inadequate maintenance by Buyer buyer supplied software or interfacing unauthorized modification or misuse operation outside the environmental specifications for the product or improper site preparation or maintenance NO OTHER WARRANTY IS EXPRESSED OR IMPLIED HP SPECIFICALLY DISCLAIMS THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE EXCLUSIVE REMEDIES THE REMEDIES PROVIDED HEREIN ARE BUYER S SOLE AND EXCLUSIVE REMEDIES HP SHALL NOT BE LIABLE FOR ANY DIRECT INDIRECT SPECIAL INCIDENTAL OR CONSEQUENTIAL DAMAGES WHETHER BASED ON CONTRACT TORT OR ANY OTHER LEGAL THEORY ASSISTANCE Product maintenance agreements and other customer assistance agreements are available for Hewlett Packard products For any assistance contact your nearest Hewlett Packard Sales and Service Office Addresses are provided at the back of this manual CW3A789
62. Interface EPCI which is a universal synchronous asynchronous receiver transmitter USART data communications IC The SCN2661 serializes parallel data from the 68000 for transmission At the same time it also receives serial data and converts it to parallel data characters for the 68000 The SCN2661 IC contains a baud rate generator which can be programmed from the logic analyzer I O menu for one of eight baud rates Protocol word length stop bits length and parity are also programmed via the I O menu Two additional ICs the DS14C88 and DS14C839 are line drivers receivers used by the SCN2661 IC for interface of terminal equipment with data communications equipment Slew rate control is provided on the ICs eliminating the need for external capacitors HP IB Interface The HP IB controller provides an interface between the microprocessor system and the HP IB in accordance with IEEE 488 standards An 8 bit data buffer and 8 bit control line buffer interface the HP IB controller to the HP IB bus The HP IB is a 24 conductor shielded cable carrying 8 data lines 8 control lines 7 system grounds and 1 chassis ground HP 1652B 1653B Theory of Operation Service Manual 6A 5 POE 3 V P h Logic Analyzer Theory of Operation Data Acquisition Arming Control HP 1652B 1653B Service Manual The HP 1652B 1653B logic analyzer operation 1s based around a 68000 microprocessor and proprietary acquisition ICs Input data
63. PULSE GENERATOR POWER SUPPLY ASSEMBLY DISK DRIVE ASSEMBLY INTENSITY ADJUSTMENT ASSEMBLY LINE FILTER SWITCH ASSEMBLY PROBE TIP ASSEMBLY 1652B PROBE TIP ASSEMBLY 1653B OSCILLOSCOPE BOARD ASSEMBLY 2 CHANNEL ATTENUATOR ASSEMBLY PROBE 500 MHZ 1M 10 1 FAN TUBEAXIAL 100 CFM 12VDC REPLACEMENT PROBE LEADS PKG OF 5 REPLACEMENT PROBE GROUNDS PGK OF 5 REPLACEMENT POD GROUNDS PKG OF 5 GRABBER ASSEMBLY SET 20 1652B GRABBER ASSEMBLY SET 20 1653B FUSE 3A 250V NTD FE UL NUT U TP M3 X 0 500 3MM THK TOP COVER NUT HEX PRVLG TRQ M4 X 0 7 5MM THK CRT NUT DBL CHAM 3 8 32 THD0 094 IN THK RPG BNC NUT DBL CHAM 1 4 32 THD0 062 IN THK INTEN ADJ SCREW M3 X 0 5 8MM LG DISK DRIVE REAR PANEL SCREW M3 5 X 0 6 FAN SCREW M3 X 0 5 8MM FEET LINE FIL TOP COVER SCREW M3 X 0 5 25MM LG KEYPAD SCREW TAPPING M4 2 SYSTEM BOARD M5 SHOULDER SCREW HANDLE WASHER LK INTL T NO 80 168 IN ID HP IB CABLE WASHER LK INTL T 3 8 INO 377 IN ID BNC WASHER LK INTL T 1 4 INO 256 IN ID INTEN ADJ FAN GUARD FAN MOUNTING CLIP CLAMP FL CA 1 WD DISK DRIVE CABLE HEX STANDOFF 0340 HP IB CABLE NUT PLATE HANDLE NUT 1 2 28 125 ATTENUATOR BNC WASHER FLAT PC BOARD BRACKET Mfr Code 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480 28480
64. RATOR POWER METER LOGIC ANALYZER o OWER POWE SENSOR POWER SPLITTER Figure 3 54 Setup for Bandwidth Test O1652E 15 2 Using an N to BNC adapter connect the other power splitter output to the channel 1 input of the HP 1652B 1653B oscilloscope 3 In the System Configuration menu turn both State Timing Analyzers off unassign all of the pods from the analyzers and turn the oscilloscope on as in the previous figure 3 44 4 Press FORMAT CHAN and turn on channel 1 by inserting the channel 1 waveform Then turn off channel 2 by deleting the channel 2 waveform HP 1652B 1653B Performance Tests Service Manual 3 45 5 Set the Input to CH 1 V Div to 100 mV Offset to 0 V Probe to 1 1 Impedance to 50 Ohms and s Div to 5 0 us as in figure 3 55 Scope Chennei Input V Div 100 0 mV Offset Probe 1 1 Impedence Preset USER s 0iv Deleg Figure 3 55 Channel Menu Configuration 6 Press TRACE TRIG and set the Run mode to Repetitive and trigger Level to 0 V as in the previous figure 3 51 7 Press DISPLAY and set Markers to Time Display to Normal Connect dots On and Grid On as in figure 3 56 Scope Waveforms Markers Time Display Connect dots On X too Trig to X Tig to 0 o s s 0i Deleg cri s Figure 3 56 Waveforms Display Menu Configuration 8 Set the signal generator for 100 kHz at 4 5 dBm and press RUN on the HP 1652B 1653B The signal on screen should be five cycles at two divi
65. Saudi Arabia 8120 2857 Stroight Shielded 79 200 Coco Brown So Africo India Unpolarized in many nations 8120 1378 Straight NEMA5 15P 90 228 Jade Gray United States 8120 1521 90 90 228 Jade Gray Canada 8120 1992 Straight Medical 96 244 Black Mexico UL544 Phillipines Taiwan 8120 0698 Straight NEMA6 15P 90 228 Black United Stotes Conada 30 76 Jade Gray For interconnecting 96 244 system components and peripherals United States and Canada only 79 200 i 79 200 79 200 79 200 79 200 Jade Gray Republic of South Africa 79 200 India 90 230 Derk Gray Japan 90 230 100V Rev 11NOV88 ARTOOO 19 Part number shown for plug is industry identifier for plug only Number shown for cable is HP part number for complete cable including plug These cords are included in the CSA certification approval of the equipment E Earth Ground L Line NzNeutral 8120 1396 CEE22 V1 8120 1625 System Cabinet Use 250V 8120 2104 Switzerland 8120 2296 Straight SEV1011 1959 24507 Type 12 90 Denmark 8120 2956 8 120 2957 Straight DHCK107 90 OPT 917 8120 4211 8120 4600 Straight SABS164 90 OPT 918 8120 4753 8120 4754 Straight Miti 90 Installation HP 1652B 1653B 2 4 Service Manual EE NNN User interface The front panel user interface of the HP 1652B 1653B co
66. TRIGGER TRIGGER TRIGGER a FROM ARM SCOPE TRIGGER SYSTEM BOARD TRIGGER ASSEMBLY A FINE TRIG LEVEL ELM TIMEBASE HYBRID BUFFERED DATA RENE 7 PROBE 5 REAR COMP PANEL Lo au J DIGITAL CONTROL DATA DIGITAL INTERFACE OFFSET ANALOG INTERF ACE ADDRESS TRIG LEVEL D A CONV FROM SYSTEM BOARD ASSEMBL Y 01652819 Figure 6A 2 Oscilloscope Assembly Block Diagram HP 1652B 1653B Theory of Operation Service Manual 6A 3 Power Supply The switching power supply provides 120 W 200 W maximum for the instrument Assembly The ac input to the power supply is 115V or 230 V 25 to 1570 Maximum input power is 350 VA maximum The ac input frequency is 48 to 66 Hz All voltages necessary to operate the instrument are applied first to the Main Assembly Unfiltered voltages of 15V 12V 12V 5 15V 5 2V and 3 5V are supplied to the board where they are then filtered and distributed throughout the main assembly board oscilloscope board and to the CRT Monitor Assembly Filtered voltages of approximately 5 V and 12 V are routed through the Main Assembly to the CRT Monitor Assembly The 5 15 V supply is adjustable on the supply CRT Monitor The CRT Monitor Assembly consists of the sweep board circuitry a 9 inch white Assembly phosphor CRT and the CRT yoke The assembly requires 5 V and 12 V from the power supply via the Main Assembly The non interlacing raster display is co
67. Threshold test passed Disk test LOADING SYSTEM FILE As indicated by the last message the HP 1652B 1653B logic analyzer will automatically load from the operating system disk in the disk drive If the operating system disk is not in the disk drive the message SYSTEM DISK NOT FOUND will be displayed at the bottom of the screen and NO DISK will be displayed in front of the disk test in place of passed el If the message SYSTEM DISK NOT FOUND appears on screen insert the Note operating system disk into the disk drive and press any front panel key HP 1652B 1653B Self Tests Service Manual 6B 1 A Selectable Selectable self tests are used as troubleshooting aids Eight self tests may be g Self Tests invoked via the Self Tests menu e Analyzer Data Acquisition e Scope Data Acquisition e RS 232 C e BNC Keyboard e RAM e ROM e e Disk Drive Cycle through tests The required test is selected by moving the cursor to the test and pressing the front panel SELECT key A pop up menu will appear with a description of the test to be performed The self test does not begin until the cursor 1s placed on Single test Repetitive test or Execute and the front panel SELECT key is pressed The repetitive self tests display the number of runs and failures for the selected test Press STOP to discontinue the test After the test is completed either Passed Failed or Tested will be displayed on the Self Tests menu in f
68. a displayed on the Timing Waveforms display is all high for the pod and channels under test as in figure 3 39 MACHINE 1 Timing Waveforms Merkers Accumulate Off POD 1 00 Time Div Deley Semple period a anne 20 ns Figure 3 39 Threshold Accuracy Timing Waveforms 1 7 Adjust the power supply output for 150 mV 8 Press RUN Data displayed on the Timing Waveforms display is all low for the channels under test as in figure 3 40 MACHINE Timing Waveforms Markers Accumulate Off POD 1 06 Time Div Delay Semple period mig a 20 ns Figure 3 40 Threshold Accuracy Timing Waveforms 2 9 Return to the Timing Format Specification and change the User Defined pod threshold to 4 9 9 V 10 Adjust the power supply output for 10 2 V 11 Press RUN Data displayed on Timing Waveforms display is all high for the pod and channels under test as in the previous figure 3 39 Performance Tests 3 33 12 Adjust the power supply output for 9 6 V 13 Press RUN Data displayed on Timing Waveforms display is all low for the pod and channels under test as in the previous figure 3 40 14 Return to the Timing Format Specification and change the User Defined pod threshold to 9 9 V 15 Adjust the power supply output for 9 6 V 16 Press RUN Data displayed on Timing Waveforms display is all high for the pod and channels under tes
69. ace bus requires a unique address Selection The address provides a method for the system controller to select individual instruments on the bus The address of the HP 1652B 1653B defaults at power up to decimal 07 To change the address of the HP 1652B 1653B proceed as follows 1 Press the I O key on the front panel keypad and the I O menu will appear on screen 2 Rotate the KNOB until I O Port Configuration is highlighted 3 Touch the SELECT key and the External I O Port Configuration menu will appear on screen External I 0 Port Configuration Printer connected to RS 232 C Controller connected to HP IB RS 232 C Configuration HPIB Configuration Protocol XON XOFF HPIB Address Stop Bits 1 Perity Beud rete 9600 Data Bits 8 Psinter Information Printer Paper uidth Figure 2 4 External I O Port Configuration Menu 4 Select the HP IB Address field with the KNOB and press the SELECT key 5 When the pop up field appears on screen rotate the KNOB to select the desired HP IB address Installation HP 1652B 1653B 2 6 Service Manual 6 Touch the SELECT key to enter the new address 7 Select the DONE field in the upper right corner of the menu using the KNOB and SELECT key to exit the External I O Port Configuration menu A ew PC 4 3 RS 232 C The HP 1652B 1653B interfaces with RS 232 C communication lines through a Interface standard 25 pin D connector The HP 1652B 1653B
70. alling edge of the J clock as the Master clock and rising edge of the J clock as the Slave clock 10 Disconnect bits 0 3 and bits 8 11 from the test connector and attach bits 4 7 and bits 12 15 to the test connector Repeat steps 3 4 6 7 and 8 until all pods have been tested pods 1 through 5 with all clocks HP 1652B 1653B Performance Tests Service Manual 3 23 Clock Qualifier and Data Inputs Test 6 Description This performance test verifies the maximum clock rate for demultiplexed clocking during a state operation Specification Clock repetition rate Single phase 35 MHz maximum 25 MHz maximum for the HP 1653B With time or state counting minimum time between states is 60 ns 16 7 MHz maximum Both mixed and demultiplexed clocking use master slave clock timing the master clock must follow the slave clock by at least 10 ns and precede the next slave clock by 50 ns Equipment Required Pulse Generator o ooooooooooooo HP 8161A 020 Oscilloscope HP 54502A 50 Ohm Feedthrough 2 HP 10100C Test Connector 2 oo see figure 3 1 and 3 2 BNC m m Coupler 2 HP 1250 0216 BNC Cable 2 pd eia d vet HP 10503A BNC Tee m f f 2 ocu eR ees HP 1250 0781 Procedure 1 Connect the HP 1652B 1653B and test equipment as in figure 3 26 by connecting channels 0 7 of the pod under test to the test connector During demulti
71. an identifying five digit code All parts in this list except hardware are manufactured by or for Hewlett Packard code 28480 No list of manufacturers is provided NENNEN Exchange Assemblies HP 1652B 1653B Service Manual Some parts used in this instrument have been set up for an exchange program This program allows the customer to exchange a faulty assembly with one that has been repaired calibrated and performance verified by the factory The cost is significantly less than that of a new part The exchange parts have a part number in the form XXXXX 695XX After receiving the repaired exchange part from Hewlett Packard a United States customer has 30 days to return the faulty assembly For orders not originating in the United States contact the local HP service organization If the faulty assembly is not returned within the warranty time limit the customer will be charged an additional amount The additional amount will be the difference in price between a new assembly and that of an exchange assembly Replaceable Parts 5 1 eee Orderi ng To order a part in the material list quote the HP part number indicate the Information quantity desired and address the order to the nearest HP Sales Service Office To order a part not listed in the material list include the instrument part number instrument serial number a description of the part including its function and the number of parts required Address the order to the ne
72. anel Disconnect the probe compensation cable from the oscilloscope assembly Disconnect the ground cable of the line filter from the oscilloscope assembly 0 Nl QN Un A UU Disconnect the cable assembly W8 from connector J2 on the oscilloscope assembly Assembly Removal and Replacement 6D 5 9 Remove the six screws securing the oscilloscope assembly to the support panel ucl Do not remove the two screws at the front of the oscilloscope board that hold the Note e two attenuators in place 10 Remove the two nuts H19 and two washers H20 that secure the attenuator BNCs to the front panel 11 Slide the oscilloscope assembly toward the rear panel to allow the BNCs to clear the front panel 12 Remove the oscilloscope assembly by tilting the rear of the assembly up and lifting the assembly out through the top of the instrument cabinet Make sure that the BNCs clear the front panel 13 Replace the oscilloscope assembly by reversing this procedure When you reinstall the top cover insert the four screws on the sides of the cover first while making sure the cover fits into the grooves of the instrument cabinet Then insert the six screws in the top of the cover Note GROUND CONNECTOR PROBE COMPENSATION CONNECTOR 6 SS l 01653E04 Figure 6D 3 Oscilloscope Assembly Removal Assembly Removal and Replacement HP 1652B 1653B 6D 6 Service Manual Removal and Replac
73. arest HP Sales and Service Office Direct Mail Within the USA Hewlett Packard can supply parts through a direct mail order Order System system There are several advantages to this system e Direct ordering and shipment from the HP Parts Center in California USA e No maximum or minimum on any mail order there is a minimum amount for parts ordered through a local HP office when the orders require billing and invoicing e Prepaid transportation there is a small handling charge for each order e No invoices In order for Hewlett Packard to provide these advantages a check or money order must accompany each order Mail order forms and specific ordering information are available through your local HP office Addresses and telephone numbers are in a separate document included with this manual Replaceable Parts HP 1652B 1653B 5 2 Service Manual Lond 0 lt ul m a 2 oje Ale o o gt uS l oia l r a i mM u x d oO oA 8 e x c x 33 10 N ig Ho ird eo z e Figure 5 1 HP 1652B 1 653B Exploded View arts 5 3 Replaceable P 3B l HP 1652B 165 Service Manua Table 5 1 Reference Designator and Abbreviations REFERENCE DESIGNATOR A assembly F fuse Q transistor SCH U integrated circuit B fan motor FL filter triode thyristor microcircuit BT battery H hardware R resistor V electron tube glow C capacitor J z electrical connector RT thermistor lamp CR diode dio
74. ars select Delay 23 Select Start with the front panel knob and SELECT key uc To abort the Delay calibration select Cancel using the front panel knob and Note wl SELECT key HP 1652B 1653B Adjustments and Calibration Service Manual 4 13 24 Connect a BNC cable from the Probe Compensation output on the rear panel to the channel 1 input of the HP 1652B 1653B oscilloscope The instrument will prompt you when you need to switch to the channel 2 input anc If you use a 10 1 probe in place of the recommended 1 1 BNC cable use the Note ul BNC to mini probe adapter supplied with the instrument Then set the attenuation field in step 25 to 10 1 25 Set the attenuation field in the calibration menu to the appropriate setting 26 To proceed with the calibration select Continue using the front panel knob and SELECT key 27 When the calibration is complete the updated calibration status appears on screen and the instrument remains in the Calibration menu i U Do not execute Set to Default after calibrating the instrument Otherwise your Caution calibration factors will be replaced by default calibration factors 28 Select Done with the front panel knob and SELECT key to exit the Calibration menu Adjustments and Calibration HP 1652B 1653B 4 14 Service Manual Contents Section 5 Replaceable Parts tOdO ND D 5 1 ADDreVIal0lis critica puts 5 1 Replaceable Pans icon idas dta d an eiu du 5 1 Exchange Assemblies 2 5750
75. ce section is presented in four sub sections e 6A Theory of Operation e 6B Self Tests e 6C Troubleshooting e 6D Assembly Removal and Replacement Information for operating programming and interfacing the HP 1652B 1653B is contained in the HP 1652B 1653B Operating and Programming manual set supplied with each instrument Section 1 General Information includes a description of the HP 1652B 1653B logic analyzer including its specifications options available accessories and recommended test equipment for maintaining the instrument Listed on the title page of this manual is a microfiche part number This number can be used to order 4 by 6 inch microfilm transparencies of the manual Each microfiche contains up to 96 photo duplicates of the manual pages The microfiche package also includes the latest Manual Changes supplement and pertinent Service Notes General information 1 1 Instruments The instrument serial number is located on the rear panel Hewlett Packard uses a Covered bv this tWopart serial number consisting of a four digit prefix and a five digit suffix E y separated by a letter for example 0000A00000 The prefix is the same for all Manual identical instruments and changes only when a modification is made that affects parts compatibility The suffix is assigned and is different for each instrument This manual applies directly to instruments with the serial prefix shown on the title page An instrument
76. cess to the interior of the instrument 3 3 E Recommended Equipment required for the performance tests in this section are listed in the Test Eauipment Recommended Test Equipment table in section 1 Any equipment that satisfies quip the critical specification listed in the table may be substituted for the recommended model E C Jw Test Record The results of the performance tests may be tabulated on the Performance Test Record provided at the end of this section The Performance Test Record lists the performance tests and provides an area to mark whether the test passed or failed The results recorded in the table at incoming inspection may be used for later comparisons of the tests during periodic maintenance troubleshooting and after repairs or adjustments Self Tests The power up self test is automatically performed upon applying power to the logic analyzer Self tests do not require test equipment and may be performed individually to provide a higher level of confidence that the instrument is operating properly A message tbat the instrument has failed the test will appear if any problem is encountered during the test The individual self tests may be performed for functions listed in the self test menu which is invoked via the I O menu Since the HP 1652B 1653B self test is located on the Performance Verification disk you must have the Performance Verification disk installed to run the tests HP 16
77. ckaging rss a dd 2 10 Cleaning Requirements sar Aa 2 10 Installation Introduction This section of the manual contains information and instructions necessary for setting up the HP 1652B 1653B Logic Analyzer This includes inspection procedures power requirements hardware connections and configurations and packaging information CO S b V4 Qq 8 w w Safety The safety symbols used with Hewlett Packard instruments are illustrated in the Considerations front of this manual WARNING and CAUTION symbols and instructions should be reviewed before operating the instrument These warnings and cautions must be followed for your own protection and to avoid damaging the instrument A Initial Inspect the shipping container for damage If the shipping container or cushioning Ins pection material is damaged keep it until the contents of the shipment have been checked for completeness and the instrument has been checked mechanically and electrically The contents of the shipment are listed under Accessories Supplied in Section 1 If the contents are incomplete if there is mechanical damage or defect or if the instrument does not operate properly notify the nearest Hewlett Packard office If the shipping container 1s damaged or the cushioning materials show signs of stress notify the carrier as well as the Hewlett Packard office Keep the shipping materials for the carrier s inspection The Hewlett Packard office will a
78. comparator then shapes the single ended signal and outputs it at an ECL level to the acquisition IC Tbe input data is then stored at the acquisition IC The two BNCs on the rear panel are used for arming control of the logic analyzer acquisition ICs An arm signal may be output from the ICs to the rear panel EXTERNAL TRIGGER OUT 310 or input to the ICs from EXTERNAL TRIGGER IN J9 Theory of Operation 6A 7 Memory The memory of the logic analyzer consists of three separate memories one ROM and two RAMs The system EP ROM is 32 K long by 16 wide and is used primarily for booting up the system and self test storage The system D RAM is 512 K long by 16 wide and contains the operating system and the acquired data from the target system Since the RAM is a volatile memory the operating system is loaded at each power up of the instrument via the built in disk drive and a mini floppy disk The display D RAM is 64K long by 4 wide and is cycle shared between the 68000 and the display refresh circuitry This is why the display bus is separate from the local bus The two buses are separated by a set of address multiplexers and data buffers Theory of Operation HP 1652B 1653B 6A 8 Service Manual o Oscilloscope Theory of Operation Attenuator Preamps Post Amplifier ADC and FISO Memory Triggering HP 1652B 1653B Service Manual The oscilloscope circuitry provides the conditioning sampling digitizing and storage of the s
79. d cable e Power supply cable e CRT sweep cable e HP IB cable 9 Disconnect the keyboard assembly ribbon cable from the Main Assembly 10 Carefully place the instrument on its side 11 From the bottom of the instrument remove the eight screws that secure the Main Assembly to the instrument cabinet 12 Set the instrument in the normal position 13 Slide the main assembly out of the rear of the instrument cabinet 14 Replace the Main Assembly by reversing this procedure When you reinstall the top cover insert the four screws on the sides of the cover first while making sure the cover fits into the grooves of the instrument cabinet Then insert the six screws in the top of the cover AER ooo BR Removal and Replacement of the CRT Monitor Assembly Caution W Caution W HP 1652B 1653B Service Manual The sweep board CRT and CRT yoke are all parts of one HP part number They have been adjusted as a unit and should be replaced as a unit rather than individually Do not remove the yoke from the CRT When necessary refer to other removal procedures 1 Turn off the instrument and disconnect the power cable 2 Remove the six screws from the top and the two screws from each side of the instrument s top cover 3 Lift off the top cover 4 Remove the Rear Panel Power Supply and Main Assembly Discharge the post accelerator lead to the CRT monitoring band only Components will be damaged if the post accel
80. d pda pede 1 15 Horizolilal 25 54 cone v eI page eno teu Ud ders pil bcd EE 1 15 A cessus dades as ER eee aber hor rou Dalai D d Se o deb qd 1 15 Oscilloscope Operating Characteristics esc e ence eee e eee ences 1 15 Vertical Qt BNC socorrista 1 15 HorizoBtal iis choi eke As aa ee pins Beha wien tess 1 16 ss PETE eee ce QN ES an eee ai d dme nadie pair ee 1 17 Wavetorm Display ciar Ns owed 1 17 Measurement Aids 5 ERROR cai Ue db tee res adus Rond qox neat 1 18 Interactive Measurements visse s A acd queo b dts 1 19 ACGUISINGN oboe eode s ea eo bas e atu ate edulis ep discs eec gd 1 19 Mixed Displays iia ca nos 1 19 Tue CoOrelatlOB asas la no ta 1 19 Time Interval Accuracy between Modules ooooooooommmmm o rn o 1 19 General Charicienistica sida RR AAA 1 19 Operating Environment eduxi esta die 1 19 Power Requirements rriste kuti potn As 1 20 Weight CCP 1 20 DIMENSIONS v eio oa aua esae a d Sed vie aue tss miscet 1 20 Recommended Test Equipment sees 1 21 General Information 1 Py E A CLIENTE Introduction HP 1652B 1653B Service Manual This Service Manual explains how to test adjust and service the Hewlett Packard 1652B 1653B Logic Analyzer This manual is divided into six sections e 1 General Information e 2 Installation e 3 Performance Tests e 4 Adjustments and Calibration e 5 Replaceable Parts e 6 Service For easier access the Servi
81. d provides two output signals One signal 1s the same polarity as the input and goes to the trigger circuitry The other is of the opposite polarity and is sent to the post amplifier The post amplifier conditions the signal for the ADC It has a gain of approximately 2 5 and it has one compensation capacitor adjustment per channel This adjustment effects the transition rise time and overshoot A single hybrid digitizes and stores the channel signal Digitization is done by a set of comparators in a flash converter A precision voltage divider within the ADC provides a separate reference for each comparator This voltage divider is controlled by a reference supply and amplifier on the PC board The FISO fast in slow out memory is 2 k by 6 bit bytes Sample clocks are provided by the time base circuitry At 500 ns div and faster the sample clock is 400 MHz At sweep speeds of 1 us and slower the sample clocks range from 200 MHz to 25 Hz The FISO data is buffered onto the CPU data bus for further processing The trigger circuitry accepts inputs from both oscilloscope channels the logic analyzer and the time base Only one of these signals is multiplexed into the trigger circuitry depending on the trigger mode For example the input from the time base 1s used while the instrument is in the trigger immediate mode When in the edge trigger mode the preamp outputs are fed through a high speed voltage comparator using a reference voltage
82. d to be tested in the System Configuration menu 9 Disconnect the lower eight bits bits 0 through 7 from the test connector and attach the upper eight bits bits 8 through 15 to the test connector 10 Repeat steps 3 4 6 and 7 until the upper bits of all pods have been tested pods 1 through 5 Performance Tests HP 1652B 1653B 3 30 Service Manual Threshold Description Accuracy Test This performance test verifies the threshold accuracy within the ranges stated in the specification Specification Threshold accuracy 150 mV accuracy over the range 2 0 to 2 0 volts 300 mV accuracy over the ranges 9 9 to 2 1 volts and 2 1 to 9 9 volts Equipment Required Power Supply 0 cc eee eee eens HP 6216C Test Connector ccc cee eee eee see figure 3 1 and 3 2 BNC f to Dual Banana m Adapter HP 1251 2277 BNG Cable cies o hau ao Miet tetas HP 10503A Procedure 1 Connect the test equipment as in figure 3 36 POWER LOGIC ANALYZER SUPPLY OUTPUT DATA BITS Il Freue de 01650B50 Figure 3 36 Threshold Accuracy Test Setup In this setup only eight channels are tested at one time to minimize loading The Note ground lead must be grounded to ensure accurate test results 2 Assign the pod under test to Analyzer 1 in the System Configuration as in the previous figure 3 32 HP 1652B 1653B Performance Tests Service Manual 3 31 3 Configure the T
83. dadas 6A 10 Tine InterpolatOr scr lla 6A 10 Probe Compensation citrato 6A 10 Digital Menace oc cckinse cet posue hop RE aka a A E TEE EUIS 6A 10 Analog Interace noia PETI LO6 IU WERE REOCHI PR DANA Ue 6A 10 6A Theory of Operation Introduction This section provides the theory of operation of the HP 1652B 1653B Logic Analyzer The theory of operation is included for information only and is not intended for troubleshooting purposes Safety Warning Wy Read the Safety Summary at the front of this manual before servicing the instrument Before performing any procedure review it for cautions and warnings Maintenance should be performed by trained service personnel aware of the hazards involved for example fire and electric shock When maintenance can be performed without power applied the Power cord should be removed from the instrument Block Level Theory HP 1652B 1653B Service Manual The HP 1652B is an 80 channel state and timing logic analyzer with a 2 channel 100 MHz 400 Msample s digitizing oscilloscope The HP 1653B is a 32 channel state and timing logic analyzer with a 2 channel 100 MHz 400 Msample s digitizing oscilloscope The human interface is a front panel keypad and knob for instrument control and a 9 inch diagonal white phosphor CRT for information display Available on the rear panel are RS 232 C and HP IB ports for communication to a printer or from a controller Also on the rear panel are
84. de thyristor stationary portion jack S switch jumper VR voltage regulator varactor L coil inductor transformer breakdown diode DL delay line MP misc mechanical part TB terminal board W cable DS annunciatornlamp LED P electrical connector TP test point X socket E misc electrical part moveable portion plug Y crystal unit piezo electric or quartz ABBREVIATIONS A amperes DWL dowel MFR manufacturer RND Round A D analog to digital ECL emitter coupled logic MICPROC microprocessor ROM read only memory AC alternating current ELAS elastomeric MINTR miniature RPG rotary pulse generator ADJ adjust ment EXT external MISC miscellaneous RX receiver AL aluminum F farads metal film MLD molded S Schottky clamped AMPL amplifier resistor MM millimeter seconds time ANLG analog FC carbon film MO metal oxide SCR screw silicon ANSI American National composition MTG mounting controlled rectifier Standards Institute FD feed MTLC metallic SEC second time secon ASSY assembly FEM female MUX multiplexer dary ASTIG astigmatism FF flip flop MW milliwatt SEG segment ASYNCHRO asynchronous FL flat N nano 10 9 SEL selector ATTEN attenuator FM foam from NC no connection SGL single AWG American wire gauge FR front NMOS n channel metal SHF shift BAL balance FT gain bandwidth oxide semiconductor SI silicon BCD binary code decimal product NPN negat
85. dge grabbers from the test connector 10 Repeat steps 3 4 6 7 8 and 9 until all pods have been tested pods 1 through 5 Start with the falling edge of the J clock as the Master Clock and rising edge of the J clock as the Slave Clock Performance Tests HP 1652B 1653B 3 26 Service Manual Glitch Test Description This performance test verifies the glitch detection specification of the HP 1652B 1653B Specification Minimum detectable glitch 5 ns wide at the threshold Equipment Required Pulse Generator o ooooooomo o HP 8161A 020 Oscilloscope eese HP 54502A 50 Ohm Feedthrough HP 10100C Test Connector x urb ES end LES see figure 3 1 and 3 2 BNC m m Coupler HP 1250 0216 BNC Cable usos tad ea ife teed HP 10503A BNC Tee m f f ooooooooommmomo o HP 1250 0781 Procedure 1 Connect the test equipment as in figure 3 30 The clock inputs are not used for the glitch test since glitch detection is part of timing analysis Use the oscilloscope to make sure pulses are 5 ns wide at the threshold 1 6 V PULSE GENERATOR LOGIC ANALYZER OSCILLOSCOPE OUTPUT 01650103 Figure 3 30 Setup for Glitch Test yi In this setup only eight channels are tested at one time to minimize loading The Note E ground lead must be connected to ensure accurate test results HP 1652B 1653B Performance Tests Service Manual 3
86. e display 10 Press FORMAT CHAN and adjust V Div and Offset to obtain a waveform as shown in figure 4 4 Adjustments and Calibration 4 9 Scope Channel Input V Div 110 mV Offset Probe 1 1 Impedance _50 Ohms Preset ssoi Delay Figure 4 4 Channel Menu 11 Press Display and set Display to AVG 32 12 Select Auto Measure and verify the overshoot and rise time as shown in figure 4 5 Use the SELECT key to toggle the Auto Measure display between CH 1 and CH 2 to update the information C Scope J Waveforms M gt e Automatic Measurements Input Freq O Hz Period O s Vp p 256 1 mV Risetime 3 4 ns Hidth 0 s Preshoot 5 19 2 Oo s Falltime o s Hidth Overshoot 5 19 z Figure 4 5 Waveforms Display Menu 13 The rise time should be 3 5 nS and overshoot should be lt 10 If either of these is out of specification adjust the appropriate capacitor The capacitor locations are shown in figure 4 6 e Capacitor C119 is for Channel 1 e Capacitor C161 is for Channel 2 These capacitors are located on the oscilloscope assembly board They can be accessed through the right side of the instrument just below the power supply assembly The optimum rise time is approximately 3 2 nS Note M Increase overshoot slightly if the instrument fails the bandwidth test However keep the overshoot within the specification 14 Repeat steps 3 through 13 for channel 2 Adjustments and Calibration HP 1652B 1653
87. e performance verification tests for the oscilloscope portion Procedures are based on the model or part number for the recommended equipment Performance Tests 3 3 Logic Analyzer Performance Tests Test Connector HP 1652B 1653B Service Manual These procedures test the electrical performance of the logic analyzer by using the specifications in section 1 as the performance standards All tests may be performed without access to the interior of the instrument Results of performance tests may be tabulated in the Performance Test Record at the end of this section The logic analyzer performance tests and adjustments require connecting the pulse generator outputs to probe pod inputs Figure 3 1 is a test connector that may be built to allow testing of multiple channels up to eight at one time The test connector consists of a BNC connector and a length of wire Connecting more than eight channels to the test connector at a time will induce loading of the circuit and true signal representation will degrade Test results may not be accurate if more than eight channels are connected to the test connector The Hewlett Packard part number for the BNC connector in figure 3 1 is _ 1250 1032 An equivalent part may be used in place of the Hewlett Packard part 01650E 38 Figure 3 1 Test Connector For quicker connection without the use of grabbers a test connector may be built as shown in figure 3 2 to allow testing of multiple
88. e screen Then note the FOCUS control position 5 Set the sweep board FOCUS control for mid position between the two positions noted in steps 3 and 4 for best over all pixel focus Horizontal Phase 1 Refer to the previous figure 4 2 for adjustment locations Vertical Linearit S y 2 Press DISPLAY to place the Timing Waveforms menu on the screen of the and Height HP 1652B 1653B Adjustments ud This menu is used because it has characters and lines throughout the menu which Note d are watched during the procedures Any other menu may be used however the adjustments may not be as accurate 3 Adjust the sweep board H PHASE control to center the menu horizontally on the CRT screen 4 Adjust the sweep board V LIN control so that the top and bottom rows of text are equal in height Text height should be approximately 1mm 5 Adjust the sweep board HEIGHT control so that the screen menu top and bottom borders are equal in width to the side borders of the menu HP 1652B 1653B Adjustments and Calibration Service Manual 4 5 6 Readjust steps 4 and 5 as necessary for a uniform display of the screen menu ucl The V LIN and HEIGHT adjustments interact with each other and may need to be Note i repeated for best results System Board Equipment Required Assembly Digital Voltmeter ccccccsescssescssecssscesssecessescesseees HP 3478A Threshold Power Supply Cable 54503 61604 Adjustment Procedure ul The threshold
89. ed Calibration DC Power Supply intret rte HP 6114A Digital Voltmeter ooooooooocconoococccccoccoccncccnnnnos HP 3478A 6 Select the Calibration choice field and when the pop up appears select Attenuation 7 Connect the power supply to the HP 1652B 1653B oscilloscope and monitor the supply with the digital voltmeter as shown in figure 4 7 INPUT POWER SUPPLY LOGIC ANALYZER MULTIMETER 01652E 14 Figure 4 7 Attenuator Calibration Setup 8 Select Start with the front panel knob and SELECT key The instrument will display the appropriate DC voltages required and prompt you to connect the power supply to the appropriate channel ucl To abort the Attenuator calibration select Cancel using the front panel knob and Note E SELECT key Adjustments and Calibration HP 1652B 1653B 4 12 Service Manual 9 Adjust the power supply to within 0 1 of the specified voltage If the measured DC source varies more than 0 1 select the voltage field with the front panel knob and SELECT key Then enter the source level and select DONE 10 To proceed with the calibration select Continue using the front panel knob and SELECT key 11 Repeat steps 9 and 10 for each specified voltage and channel 12 When the calibration is complete the updated calibration status appears on screen and the instrument remains in the Calibration menu 13 Disconnect the power supply from the HP 1652B 1653B inputs Gain
90. ed by moving the cursor to the test and pressing the front panel SELECT key A pop up menu appears with a description of the test to be performed The self test does not begin until the cursor is placed on Execute Single test or Repetitive test and the front panel SELECT key is pressed After the test has been completed either Passed Failed or Tested will be displayed on the Self Test menu in front of the test These self tests are used as troubleshooting aids For more information refer to section 6 HP 1652B 1653B Service Manual DELL oo o o o Performance Test Interval Periodic performance verification of the HP 1652B 1653B is required at two year intervals The instrument s performance should be verified after it has been serviced or if improper operation is suspected Calibration should be performed before any performance verification tests Further checks requiring access to the interior of the instrument are included in the adjustment section but are not required for the performance verification eee Performance Test Procedures HP 1652B 1653B Service Manual All performance tests should be performed at the instrument s environmental operating temperature and after a 15 minute warm up The performance tests for the HP 1652B 1653B are separated into two sections The first section contains the performance verification tests for the logic analyzer portion of the HP 1652B 1653B and the second section contains th
91. ement of the Attenuators Caution i i Note Y E Note HP 1652B 1653B Service Manual Attenuators are not part of the oscilloscope board If the oscilloscope board is replaced the attenuators must be moved to the replacement board ELECTROSTATIC DISCHARGE can damage electronic components Use grounded wriststraps and mats when servicing attenuators When necessary refer to other removal procedures 1 Turn off the instrument and disconnect the power cable 2 Remove the six screws from the top and the two screws from each side of the instrument s top cover 3 Lift off the top cover 4 Remove the Disk Drive Power Supply and Oscilloscope Assembly 5 From the component side of the Oscilloscope Assembly remove the two screws that secure the Attenuator 6 A 24 pin connector located at the rear of the inside of the attenuator connects the attenuator to the PC board With a gentle rocking or prying motion lift the attenuator from the PC board Prying at the rear of the attenuator with a small flat blade screwdriver between the attenuator and the PC board will help control the attenuator removal 7 Replace the attenuator by reversing this procedure When you reinstall the top cover insert the four screws on the sides of the cover first while making sure the cover fits into the grooves of the instrument cabinet Then insert the six screws in the top of the cover Assembly Removal and Replacement 6D 7
92. ents and Calibration Introduction Caution y This section provides the adjustment procedures for the HP 1652B 1653B The primary adjustments groups are e Power Supply Assembly Adjustment e CRT Monitor Assembly Adjustment e System Board Assembly Threshold Adjustment e Oscilloscope Assembly High Frequency Pulse Adjustment This section also contains the software calibration procedures for the oscilloscope assembly The effects of ELECTROSTATIC DISCHARGE can damage electronic components Use grounded wriststraps and mats when performing any kind of service to this instrument Equipment Required The equipment required for the adjustments and calibration procedures in this section are listed in the Recommended Equipment table in section 1 of this manual Any equipment that satisfies the critical specifications listed in this table may be substituted for the recommended model Equipment for individual procedures is listed with the procedure Adjustments and Calibration Interval Warning Wy HP 1652B 1653B Service Manual The recommended adjustment interval for the HP 1652B 1653B is two years The adjustments are set at the factory on assemblies when they are tested However adjustments may be necessary after repairs have been made to the instrument Usually the only assembly that may require adjustments is the assembly that has been replaced Read the Safety Summary at the beginning of this manual before p
93. epeat steps 3 4 6 and 7 until all pods have been tested pods 1 through 5 9 Disconnect the lower eight bits bits 0 through 7 from the test connector Attach the upper eight bits bits 8 through 15 to the test connector Then repeat steps 3 4 6 7 and 8 until the upper bits of all pods have been tested pods 1 through 5 HP 1652B 1653B Performance Tests Service Manual 3 17 Clock Qualifier Description and Data Inputs Test 4 This test verifies the minimum swing voltages of the input probes and the maximum clock rate of the HP 1652B 1653B when it is in the single phase mode Specification Minimum swing 600 mV peak to peak Clock repetition rate Single phase is 35 MHz maximum 25 MHz maximum for the HP 1653B Clock pulse width gt 10 ns at threshold Equipment Required Pulse Generator cun Er d dr HP 8161A 020 Oscilloscope isse eE AERE DTE EE ea HP 54502A 50 Ohm Feedthrough 2 HP 10100C Test Connector 2 see figure 3 1 and 3 2 BNC m m Coupler 2 HP 1250 0216 BNC Cable 2 0 0c cece eee eee ee HP 10503A BNC Tee m f f 2 2 0 0 ccc eee eee HP 1250 0781 Procedure 1 Connect the HP 1652B 1653B and test equipment as in figure 3 19 In order to most accurately measure the amplitude of the test signals from the pulse generator high impedance scope probes should be used to look at the signal levels at the output of the
94. erator 1s discharged to other areas 5 Connect a jumper lead between the mounting band of the CRT and the shaft of a screwdriver 6 Discharge the CRT by placing the grounded screwdriver under the protective rubber cap of the post accelerator lead and momentarily touching the screwdriver to the metal clip of the post accelerator The CRT may charge up by itself even while disconnected Discharge the CRT before handling Use a jumper lead to short the CRT post accelerator terminal to the CRT mounting band Assembly Removal and Replacement 6D 11 7 Disconnect the post accelerator lead from the CRT by firmly squeezing the rubber cap until the metal clip disengages from the CRT 8 Disconnect the following cables at the sweep board or CRT e Intensity cable e CRT Monitor ribbon cable e Two CRT yoke cables e CRT base cable 9 Slide the sweep board up and out of the cabinet slot When installing the sweep board it may be necessary to press on the center of the outer shield of the sweep board to allow the board to clear the cabinet support rib 10 Carefully place the instrument with the front panel facing down 11 Remove the four nuts securing the CRT to the front panel 12 Remove the sweep board guide 13 Remove the CRT When reinstalling the CRT place it with the post accelerator terminal toward the inside of the instrument away from the sweep board 14 Replace the CRT Monitor Assembly by reversing this procedure
95. erforming any adjustment procedures Software calibration should be done on the HP 1652B 1653B oscilloscope under any of the following conditions e At six month intervals or every 1 000 hours e If the ambient temperature changes more than 10 C from the temperature at the last software calibration e To optimize measurement accuracy Adjustments and Calibration 4 1 a Safety Specific warnings cautions and instructions are placed wherever applicable Requ irements throughout the manual These must be observed during all phases of operation service and repair of the instrument Failure to comply with them violates safety standards of design manufacture and intended use of this instrument Hewlett Packard assumes no liability for the failure of the customer to comply with these safety requirements Instrument Adjust and calibrate the instrument at it s environmental ambient temperature and Wa rm up after a 15 minute warm up Ad justments Unless specified elsewhere each adjustment procedure must be followed in its entirety and in the same sequence shown ub The adjustment procedures are performed with the top cover of the instrument Caution removed Take care to avoid shorting or damaging internal parts of the instrument WG Read the Safety Summary at the beginning of this manual before Warning performing any adjustment procedures Calibration The calibration procedures in this section should be followed in the
96. ervice Manual a Move the cursor to the Pod Clock field and press SELECT Then assign Mixed Clocks b Move the cursor to the clock fields and assign the falling transition of the J clock to the Master Clock and the rising transition of the J clock to the Slave Clock c Move the cursor to the appropriate bit assignment field and turn on channels 0 3 and 8 11 of the pod under test d Move the cursor to the Clock Period and set it to 60 ns 5 Set the State Trace Specification without sequencing levels and Count Off as in the previous figure 3 14 6 Press RUN The State Listing displays alternating Fs and Os for the channels under test as in figure 3 25 MACHINE State Listing Markers Off Lebel gt Bese gt 0000 0001 0002 0003 0004 0005 Figure 3 25 State Listing for Data Test 5 t To ensure a consistent pattern of alternating Fs and Os use the front panel ROLL Note qui field and knob to scroll through the State Listing 7 Connect the next clock to the test connector and repeat steps 4 and 6 Repeat these steps until all clocks have been tested clocks J K L M and N 8 Remove the probe tip assembly from the logic analyzer probe cable and attach it to the next logic analyzer probe cable to be tested Take care not to dislodge grabbers from the test connector 9 Repeat steps 3 4 6 and 7 until channels 0 3 and 8 11 of all pods have been tested pods 1 through 5 Start with the f
97. ess DISPLAY and set the Markers to Time Display to AVG 32 Connect dots On and Grid On as in figure 3 52 Scope Waveforms Markers _Time Display avo 32 Connect dois On X to 0 Tig tox 0 s trig tool 09 s s D1v Delay Grid Figure 3 52 Waveforms Display Menu 7 Press FORMAT CHAN and set V Div and Offset according to the first line of the following table Test V Div Offset Power Supply Tolerance Offset Result 1 0 V 20 0 V 20 0 V 0 502 V 19 50 20 50 V 500 mV 10 0 V 10 0 V 0 242 V 9 758 10 242 V 200 mV 5 0 V 5 0 V 0 122 V 4 878 5 122 V 100 mV 2 0 V 2 0 V 0 052 V 1 948 2 052 V 8 Set the power supply to the voltage listed on the first line of the previous table HP 1652B 1653B Performance Tests Service Manual 3 43 9 Press RUN and readjust Offset so the trace is as close to the center 10 11 12 13 14 17 horizontal line of the graticule as possible after it has settled averaging complete as in figure 3 53 C Scope thennei Input CH 1 V Div 1 000 V Offset 19 93 Y Probe 1 1 Impedance MOhm Preset s Diw 10 00 us Deley Figure 3 53 Channel Menu Verify that the Offset voltage is within the limits specified in the previous table Then press STOP Repeat steps 7 through 10 for each line of the table Turn on channel 2 by inserting a waveform on the display Refer to steps a through c if you are unfamiliar with menus a Move the cursor to CH 1 a
98. est panel system 1 In HP 1652B 1653B Self Tests menu move the cursor to Keyboard and press SELECT A menu will appear with a description of the test and fields to Execute the test or exit the menu Done Move the cursor to Execute and press SELECT A menu displaying the front panel keys will appear on screen Press all of the keys on the front panel keypad and rotate the front panel RPG knob to verify their operation Press the front panel STOP key twice to return to the Keyboard Self Test menu To return to HP 1652B 1653B Self Tests menu move the cursor to Done and press SELECT RAM Self Test The RAM self test verifies the operation of system RAM and display RAM HP 1652B 1653B Service Manual 1 In HP 1652B 1653B Self Tests menu move the cursor to RAM and press SELECT A menu will appear with a description of the test the number of runs and failures for the selected test and fields to select Single test Repetitive test or Done Move the cursor to Single test or Repetitive test and press SELECT The message Running RAM Test appears on screen while the instrument is performing the test When the test is finished the message RAM Test complete will appear on screen If you are running repetitive tests press the front panel STOP key when you want to discontinue the test The number of runs and failures will be displayed in the menu Self Tests 6B 5 4 Toreturn to HP 1652B 1653B Se
99. etitive acquisitions may be halted when the comparison between the current state acquisition and the current compare image is equal or not equal Displays Compare Listing display shows the compare image and bit masks The Difference Listing display highlights differences between the current state acquisition and the current compare image State X Y Chart Display This function plots the value of the specified label on the y axis versus states or another label on the x axis Both axes can be scaled by the user Markers The markers are correlated to state listing state compare and state waveform displays They are available as pattern time or statistics with time counting on and states with state counting on Accumulate Chart display is not erased between successive acquisitions State Waveform Display This function displays a state acquisition in a waveform format States div 1 to 104 states Delay 1023 to 1024 states Accumulate The waveform display is not erased between successive acquisitions Overlay Mode Multiple channels can be displayed on one waveform display line The primary use is to view a summary of bus activity Maximum Number of Displayed Waveforms 24 HP 1652B 1653B Service Manual Timing Analysis HP 1652B 1653B Service Manual Markers The markers are correlated to state listing state compare and X Y chart displays The markers can be used for pattern time or statistics with time counti
100. from step 18 2 3dB 0 2 dB REL Power meter reading true response 2 3 0 2 2 1 dB HP 1652B 1653B a Performance Tests Service Manual 3 47 20 Turn on channel 2 by inserting a waveform on the display 21 Turn off channel 1 by deleting the channel 1 waveform 22 Connect the power splitter to channel 2 and repeat steps 5 through 19 for channel 2 ul Failure of the bandwidth test can be caused by faulty attenuator or oscilloscope Note i assembly or the need for high frequency pulse response adjustment Time Description Measurement Accuracy Test This test uses a precise frequency source to check the accuracy of the time measurement functions Specification 500 ps 2 X s Div 0 01 X delta t Equipment Required Signal Generator o o ooooo o HP 8656B BNC Cable devo do pter e HP 10503A Type N m to BNC f Adapter HP 1250 0780 Procedure 1 Use a Type N to BNC adapter to connect the signal generator to the channel 1 input of the HP 1652B 1653B oscilloscope as in figure 3 58 SIGNAL GENERATOR LOGIC ANALYZER 91652616 Figure 3 58 Setup for Time Measurement Accuracy 2 In the System Configuration menu turn both State Timing Analyzers off unassign all of the pods from the analyzers and turn the oscilloscope on as in the previous figure 3 44 3 Press FORMAT CHAN and turn on channel 1 by inserting the channel 1 waveform Then turn off channel 2 by deleting the cha
101. gger delay counter When the countdown reaches zero the sample clocks are stopped and the CPU 1s signaled that the acquisition is complete Fine Interpolator The Fine Interpolator is a dual slope integrator that acts as a time interval stretcher When the trigger circuitry receives a signal that meets the programmed triggering requirements it signals the time base The time base then sends a pulse to the fine interpolator The pulse is equal in width to the time between the trigger and the next sample clock The fine interpolator stretches this time by a factor of approximately 375 Meanwhile the time base hybrid runs a counter with a clock derived from the sample rate oscillator When the interpolator indicates the stretch is complete the counter is stopped The count represents with much higher accuracy the time between tbe trigger and the first sample clock The count is stored and used to place the recently acquired data in relationship with previous data Probe Anoscillator generates a 1 25 kHz square wave with fast edges for oscilloscope Com pensation probe compensation The oscillator s levels range from approximately 400 mV to 000 mV Digital Interface The Digital Interface provides control and interface between the system control and digital functions in the acquisition circuitry Analog Interface The Analog Interface provides control of analog functions in the acquisition circuitry It is primarily a 16 channel DAC with an accu
102. he fan cable Remove the fan by removing the four screws securing the fan to the rear panel 7 Replace the fan by reversing this procedure ucl When you reinstall the top cover insert the four screws on the sides of the cover Note first while making sure the cover fits into the grooves of the instrument cabinet Then insert the six screws in the top of the cover Removal and Replacement of the Main Assembly l W ELECTROSTATIC DISCHARGE can damage electronic components Use Caution grounded wriststraps and mats when servicing the main assembly When necessary refer to other removal procedures 1 Turn off the instrument and disconnect the power cable 2 Remove the six screws from the top and the two screws from each side of the instrument s top cover 3 Lift off the top cover 4 Remove the Disk Drive Power Supply and Oscilloscope Assembly 5 Loosen the two screws that hold the rear bracket on the oscilloscope assembly support panel until the bracket moves freely 6 Remove the support panel by tilting the rear of the panel up and lifting the panel out through the top of the instrument cabinet as in the previous figure 6D 4 Make sure the metal tabs on the support panel clear the front panel 7 Remove the Rear Panel Assembly Assembly Removal and Replacement HP 1652B 1653B 6D 10 Service Manual Note 13 8 Remove the following cables from the main assembly board e Disk drive cable e Oscilloscope boar
103. he oscilloscope assembly without the support panel to allow unabstracted access to A1R95 h Reconnect the oscilloscope assembly to the system assembly with the appropriate cable Adjustments and Calibration 4 7 i Reconnect the line filter assembly to the power supply j Reconnect the power cord and turn on the instrument k Repeat steps 5 and 6 l Set the User defined pod threshold of the pod assigned to 9 9 V m With the digital voltmeter connected adjust A1R95 for reading of 9900 V 0 0005 V Refer to figure 4 3 for adjustment locations n Set the User defined pod threshold to 9 9 V o Note the difference between this reading and 0 9900 V p Adjust A1R95 so the difference in step d is halved 30 0005 V q When the adjustment is complete turn off the instrument and remove the power cord Then reassemble the instrument Refer to the section Removal and Replacement of the Oscilloscope Assembly for addition information on reassembling the instrument EXAMPLES Ifthe reading is 9952 V the difference is 0052 V Adjust A1R95 for 9926 V 0 0005 V If the reading is 9834 V the difference is 0066 V Adjust AIR95 for 9867 V 0 0005 V Adjustments and Calibration HP 1652B 1653B 4 8 Service Manual BEEN Oscilloscope Assembly High Frequency Pulse Adjustment A Note LL Caution W HP 1652B 1653B Service Manual This procedure optimizes the pulse response so that the instrument will meet
104. ice Manual 6 Using the knob and SELECT key set Input to CH 1 Probe to 1 1 and Impedance to 1 MOhm as in figure 3 46 C Scope Channel Input V Div Offset 250 0 mV Probe Impedance Preset Div Delay Figure 3 46 Channel Menu Configuration 7 Press the TRACE TRIG key and set the Mode to Immediate and Run mode to Repetitive as in figure 3 47 Scope Trigger Calibration Mode Immediate Run mode s Div Deley Figure 3 47 Trigger Menu Configuration Performance Tests 3 39 Performance Tests 3 40 8 Press DISPLAY and set Markers to Time Display to AVG 32 Connect dots to On and Grid to On as in figure 3 48 Scope Waveforms Merkers Time X to 0 s oiv 10 00 us Delay Display Trig to X 32 Connect dots On Grid Figure 3 48 Waveforms Menu Configuration Trig to oC os 9 Press the FORMAT CHAN key and set V Div and Offset according to the first line of the following table V Div 10 0 V 5 0 V 2 0 V 1 0 V 500 mV 200 mV 100 mV 50 mV 20 mV 15 mV Offset 20 00 V 10 00 V 4 00 V 2 00 V 1 00 V 400 mV 200 mV 100 mV 40 mV 30 mV Power Supply 35 0 V 17 5 V 7 0 V 3 5 V 1 75 V 700 mV 350 mV 175 mV 70 mV 50 mV Test Tolerance 3 242 V 1 622 V 0 650 V 0 326 V 0 164 V 66 8 mV 34 4 mV 18 2 mV 8 48 mV 6 86 mV X and O Result 31 758 38 242 V 15 878 19 122 V 6 935 7 065 V 3 174 3 826 V 1 58
105. ifications listed 1n the table Table 1 1 Recommended Test Equipment Recommended Instrument Critical Specifications Model Use Oscilloscope dual channel HP 54502A P dc to 300 MHz Pulse 5 ns pulse width HP 8161A 020 P Generator 20 ns period 13 ns risetime double pulse 100 kHz Repetition Rate Overshoot 5 of Amp Pulse Risetime x 300 ps Picosecond Pulse A Generator Labs 2700C Signal Frequency 100 kHz to 300 MHz HP 8656B P Generator Output Accuracy 1 dB Power 10 2 V output HP 6216C P Supply current 0 to 0 4 amperes DC Power Range 100 mV to 5 V HP 6114A P A Supply Accuracy 0 1 Digital 5 5 digit resolution HP 3478A PAT Voltmeter Accuracy 0 025 Power Meter 1 to 500 MHz 70 dBm to 0 dBm 1 2 HP 436A P Power Sensor HP 8482A Power 50 ohms type N outputs differ by 0 15 dB HP 11667A P Splitter Adapter Type N male to HP Part Number P BNC female qty 2 1250 0780 P Performance Tests A Adjustments T Troubleshooting HP 1652B 1653B Service Manual General Information 1 21 Instrument Adapter Adapter Adapter Power Supply Cable BNC Cable Cable Cable BNC Tee Coupler Resistor P Performance Tests General Information 1 22 Critical Specifications Type N male to BNC male BNC female to Dual Banana 50 ohm feedthrough Oty 2 No Substitute male to male 48 inch Qty 2 Banana male to Banana male Oty 2 Type N male 24 inch 1M 2F Qty 2 BNC ma
106. ignals at the channel input connectors The channels are identical The trigger circuitry input can be selected between the oscilloscope channels and the logic analyzer A 400 MHz oscillator with the time base and mux sync multiplexer synchronizer provides the sample clocking After conditioning the signals are digitized and stored in a hybrid IC containing both the ADC and memory The signal data is then transferred over the data bus where it is processed for display The channel signals are conditioned by the attenuator preamps thick film hybrids containing passive attenuators impedance converters and a programmable amplifier The channel sensitivity defaults to the standard 1 2 5 sequence other sensitivities can be set also However the firmware uses passive attenuation of 1 5 25 and 125 with the programmable preamp to cover the entire sensitivity range The input has a selectable 1 MQ or 50 input impedance Compensation for the passive attenuators is laser trimmed and not adjustable After the passive attenuators the signal is split into high frequency and low frequency components Low frequency components are amplified on the PC board where they are combined with the offset voltage The high and low frequency components of the signal are recombined and applied to the input FET of the preamp The FET provides a high input impedance for the preamp The programmable preamp adjusts the gain to suit the required sensitivity an
107. ime between states is 48 hours With tagging on the acquisition memory is halved minimum time between states is 60 ns Symbols Pattern Symbols mnemonic can be defined for the specific bit pattern of a label When the data display is SYMBOL a mnemonic is displayed where the bit pattern occurs Bit patterns can include zeros ones and don t cares Range Symbols A mnemonic can be defined covering a range of values Bit pattern for lower and upper limits must be defined as a pattern of zeros and ones When the data display is SYMBOL values within the specified range are displayed as mnemonic offset from the base of the range Number of Pattern and Range Symbols 200 per HP 1652B 1653B Symbols can be down loaded over RS 232C and HP IB General Information 1 9 General Information 1 10 State Compare Mode This mode performs a post processing bit by bit comparison of the acquired state data and the compare data image Compare Image This is created by copying a state acquisition into the compare image buffer It allows editing of any bit in the compare image to a zero one or don t care Compare Image Boundaries Each channel column in the compare image can be enabled or disabled via bit masks in the compare image Upper and lower ranges of states rows in the compare image can be specified Any data bits that do not fall within the enabled channels and the specified range are not compared Stop Measurement Rep
108. iming Format Specification for a User Defined pod threshold of 0 0 V for the pod under test and assign the lower eight bits in the bit assignment field as in figure 3 37 Refer to steps a through c if you are unfamiliar with menus MACHINE Timing Format Specification Specify Symbols Activity gt Label Pol I5 4a g7 9589 0 Figure 3 37 Threshold Accuracy Format Specification a Move the cursor to the Pod Threshold field and press SELECT b Move the cursor to User defined and press SELECT Then enter the appropriate voltage threshold c Move the cursor to the bit assignment field and turn on the appropriate eight bits to be tested on off 4 Set the Timing Trace Specification as in figure 3 38 Follow steps a through d if you are unfamiliar with menus MACHINE j Timing Trace Specification Trece mede Single Rrmed by Acquisition mode Giitch Label gt Base gt Hex Find Pattern present for Then find Figure 3 38 Threshold Accuracy Trace Specification a Move the cursor to the Acquisition mode and select the Glitch mode b Move the cursor to Find Pattern and press SELECT Then assign Don t Cares all X s and press SELECT c Set present for to gt 30 ns d Set Then find Glitch to all Don t Cares all periods Performance Tests HP 1652B 1653B 3 32 Service Manual HP 1652B 1653B Service Manual 5 Adjust the power supply output for 150 mV 6 Press RUN Dat
109. integrated circuit array TPG tapping CNDCT conductor ID inside diameter PLST plastic TPL z triple CNTR counter IN inch PNP positive negative TRANS z transformer CON connector INCL include s positive TRIG trigger ed CONT contact INCAND incandescent POLYE polyester TRMR trimmmer CRT cathode ray tube INP input POS positive position TRN turn s CW clockwise INTEN intensity POT potentiometer TTL transistor transistor D diameter INTL internal POZI z pozidrive TX transmitter D A digital to analog INV inverter PP peak to peak U micro 10 6 DAC digital to analog JFET junction field PPM parts per million UL Underwriters converter effect transistor PRCN precision Laboratory DARL darlington JKT jacket PREAMP preamplifier UNREG unregulated DAT data K kilo 103 PRGMBL programmable VA voltampere DBL double L low PRL parallel VAC volt ac DBM decibel referenced LB pound PROG programmabie VAR variable to 1mw LCH latch PSTN position VCO voltage controlled DC direct current LCL local PT point oscillator DCDR decoder LED light emitting PW potted wirewound VDC volt dc DEG degree diode PWR power VERT vertical DEMUX demultiplexer LG long R S reset set VF voltage filtered DET detector LI lithium RAM random access VS Versus DIA diameter LK lock memory W watts DIP dual in line package LKWR lockwasher RECT rectifier W z with DIV d
110. ion see your Hewlett Packard Sales Service Offices e 10 1 100 1 10 MQ 10 pf resistive divider probe set 1 5 m HP 10020A e BNCto BNC cable 12 m HP 10503A e 24 pinIC test clip HP 10211A e BNC to BNC ac coupling capacitor HP 10240B 10 1 Probes e 1MQ 7 5 pF A 1 m HP 10435A e 1MQ 10 pF miniprobe 2 m HP 10433A 1 1 Probes e 36 pF miniprobe 1 m HP 10438A e 62 pF miniprobe 2 m HP 10439A e 50 miniprobe 2 m HP 10437A 100 1 Probes e 10 MQ 2 5 pF miniprobe 2 m HP 10440A e Soft Carrying Case HP part number 1540 1066 e HP Model 1008A Option 006 Testmobile e HP Model 92192A 3 5 inch Microfloppy Disks box of ten e Rackmount Kit HP part number 5061 6175 HP 1652B 1653B General Information Service Manual 1 5 MEE 7 Logic Analyzer Specifications Probes State Mode Timing Mode The following specifications are the performance standards or limits against which the HP 1652B 1653B logic analyzer is tested Minimum Swing 600 mV peak to peak Threshold Accuracy Voltage Range Accuracy 2 0V to 2 0V 150 mV 9 9V to 2 1V 300 mV 2 1V to 9 9V 300 mV Clock Repetition Rate Single phase is 35 MHz maximum 25 MHz on the HP 1653B With time or state counting minimum time between states is 60 ns 16 67 MHz Both mixed and demultiplexed clocking use master slave clock timing The master clock must follow the slave clock by at least 10 ns and precede the next slave cl
111. ip Assemblies HP part number 01650 61608 that provide 16 data channels 1 clock channel and 1 ground lead per pod assembly The probe input specifications are listed in the Logic Analyzer Specifications of this section Five Probe Tip Assemblies are supplied with the HP 1652B and two are supplied with the HP 1653B e Grabbers for the probe tip assemblies are supplied in packages of 20 HP part number 5959 0288 One hundred grabbers 5 packages are supplied with the HP 1652B and 40 grabbers 2 packages are supplied with the HP 1653B e Two HP 10430A 10 1 1 MQ 6 5 pF 1 m mini probes e Two right angle BNC adapters HP part number 1250 0076 e One BNC to mini probe adapter HP part number 1250 1454 e One Operating System Disk e One Performance Verification Disk e One 2 3 meter 7 5 feet Power Cord see section 2 Installation for the available power cords e One Operating and Reference Manual Set e One Programming Reference Manual e One Service Manual e One RS 232C Loopback Connector General Information HP 1652B 1653B 1 4 Service Manual a ppp VW P V Accessories The following accessories are available for the HP 1652B 1653B Logic Analyzer Available e Termination Adapter HP part number 01650 63201 e HP Model 10269C General Purpose Probe Interface to connect the logic analyzer directly to microprocessor preprocessors e Preprocessors for specific microprocessors and bus systems for more informat
112. ir entirety and in the same sequence shown in this section The steps in each succeeding procedure assumes that all the previous procedures have been completed in the proper order Calibration constants are stored in system memory and not on the Operating System Disk Therefore software calibration is not required when a different Operating System Disk is used to boot the instrument on power up Adjustments and Calibration HP 1652B 1653B 4 2 Service Manual IN Power Supply Equipment Required Assembly Digital Voltmeter 1111 111111111111111111 HP 3478A Adjustment Procedure ac The Power Supply Adjustment should be performed prior to the other adjustment Note wl and calibration procedures 1 Disconnect the power cord from HP 1652B 1653B and remove the top cover Then refer to figure 4 1 for the testpoint and adjustment locations 12V 43 5V 5 20V ADJ 12V 5 2v 412V 5 20V T WOO OOO O00 4949000000000 T 3066 p ao Bees A o0o00005018 COM ENE ANM WI w8 54502E 09 Figure 4 1 Power Supply Adjustments 2 Connect the negative lead of the voltmeter to the COM test point on the Power Supply Assembly 3 Connect the positive lead of the voltmeter to 5V on the Power Supply Assembly 4 Connect the power cord to the HP 1652B 1653B and turn the instrument on 5 The voltmeter reading should be wi
113. irst line of the previous table using the keypad 13 Select Delay again and use the knob to move the rising edge of the waveform directly over the center reference as in figure 3 61 Verify that the delay is within the limits specified in the table Scope Waveforms Delay Bone markers Of Disp a Connect dots On Semple period 2 5 ns 10 2 ns s Div OFAC Figure 3 61 Waveforms Display 14 Repeat steps 12 and 13 for the other delays in the table 15 Set the signal generator to 1 MHz 16 Press DISPLAY and set Display to Normal 17 Press FORMAT CHAN and set s Div to 500 ns and Offset to 0 V 18 Repeat steps 8 through 14 using the values in the following table Delay us 2 us Tolerance Limits x 10 600 ns 989 4 to 1 010 us 10 700 ns 1 989 to 2 010 us HP 1652B 1653B Service Manual 19 Turn on channel 2 by inserting a waveform on the display 20 Turn off channel 1 by deleting the channel 1 waveform 21 Connect the signal generator to channel 2 and repeat steps 4 through 18 for channel 2 ucl Time Measurement Accuracy failure is caused by a defective oscilloscope Note wj assembly Trigger Sensitivity Description Test i This test checks the channel trigger for sensitivity at the rated bandwidth uid Before doing the Trigger Sensitivity test verify that the Trigger Calibration is valid Note Y performed in the last 6 months or 1000 hours Specification 10 096 of full scale
114. is captured by passive probing reshaped and stored into memory The data acquisition for the logic analyzer consists of the data acquisition pods acquisition ICs and the interface to the 68000 The interface to the target system is through any of the data acquisition pods There are five pods available on the HP 1652B 80 channels and two pods available on the HP 1653B 32 channels Each pod contains 16 input data probes and one external clock input for state mode measurements The data probes can be used for state or timing measurements Each pod consists of a probe tip assembly and a 4 5 foot woven cable A probe tip assembly includes 17 twelve inch probes and a common ground return This is connected to one end of the cable The other end of the woven cable terminates at the rear panel of the logic analyzer The woven cable consists of 17 signal lines 17 signal return lines 2 chassis grounds and 2 power supply lines All are woven together with polyarmid yarn Each probe input has an input impedance of 100k ohms in parallel with approximately 8 pF The probes can be grounded in two ways with a common pod ground for state measurements or with a probe tip ground for higher frequency measurements The input signals are attenuated by a factor of 10 in the passive probe The signals are applied to a comparator where they are compared against a voltage threshold to determine if the voltage level is above or below the threshold level The
115. isition system The Assembly analog input to the Oscilloscope Assembly is from either or both of two channels located at the front panel BNCs The user interface is from the front panel keyboard or with a controller via the HP IB or RS 232C connector on the rear panel A more detailed theory of the Oscilloscope Assembly follows the block level theory Theory of Operation HP 1652B 1653B 6A 4 Service Manual Keypad and Knob The front panel keypad is elastomeric and has 29 keys The keyboard rows are Assembly continually scanned at a frequency of 60 Hz When a key is pressed the signal is sent as data to the 68000 which determines the key pressed and its function The Rotary Pulse Generator RPG is connected to the front panel knob and supplies pulses to the 68000 microprocessor when the knob is turned The RPG is used for cursor movement and value entry Disk Controller The disk controller performs the necessary functions for reading or writing data to the built in disk drive of the logic analyzer The disk controller interface to the 68000 is an 8 bit bidirectional bus for data status and control word transfers The built in disk drive is a 3 5 inch double sided Sony disk drive The main features of the disk drive are low power consumption low height and high reliability with simple mechanism and electronic circuitry RS 232 C The controlling IC of the RS 232 C Interface is a Signetics SCN2661 Enhanced Interface Programmable Communications
116. ive positive SIP single in line BD board FW full wave negative package BFR buffer FXD fixed NPRN neoprene SKT skirt BIN binary GEN generator NRFR not recommended for SL slide BRDG bridge GND ground ed field replacement SLDR solder BSHG bushing GP general purpose NSR not separately SLT slot ted BW bandwidth GRAT graticule replaceable SOLD solenoid C ceramic cermet GRV groove NUM numeric SPCL special resistor H henries high OBD order by description SQ square CAL calibrate calibration HD hardware OCTL octal SREG shift register CC carbon composition HDND hardened OD outside diameter SRQ service request CCW counterclockwise HG mercury OP AMP operational amplifier STAT Static CER ceramic HGT height OSC oscillator STD standard CFM cubic feet minute HLCL helical P plastic SYNCHRO synchronous CH choke HORIZ horizontal P O part of TA tantalum CHAM chamfered HP Hewlett Packard PC printed circuit TBAX tubeaxial CHAN channel HP IB Hewlett Packard PCB printed circuit board TC temperature coefficient CHAR character Interface Bus PD z power dissipation TD time delay CM centimeter HR hour s PF picofarads THD thread ed CMOS complementary metal HV high voltage PI plug in THK thick oxide semiconductor HZ Hertz PL plate d THRU through CMR common mode rejec I O input output PLA programmable logic TP test point tion IC
117. ivision LS low power Schottky RET retainer W O z without DMA direct memory access LV low voltage RF radio frequency WW wirewound DPDT double pole M mega 106 megohms RGLTR regulator XSTR transistor double throw meter distance RGTR register ZNR zener DRC DAC refresh controller MACH machine RK rack oC degree Celsius DRVR driver MAX maximum RMS root mean square Centigrade oF degree Fahrenheit oK degree Kelvin Replaceable Parts 5 4 HP 1652B 1653B Service Manual P mE Reference Designator A1 A1 A2 A3 A4 A5 A6 A7 A8 A9 A9 A10 A11 A12 B1 H20 HP Part Number CD Qty 01652 66501 01653 66501 01652 66503 2090 0204 0960 0753 0950 1879 0950 1798 01650 61614 9135 0325 01650 61608 01650 61608 01652 66502 54503 63401 10430A 3160 0429 5959 9333 5959 9334 5959 9335 5959 0288 5959 0288 2110 0003 0535 0113 0535 0056 2950 0001 2950 0072 0515 0372 0515 0821 0515 1035 0515 1135 0515 1951 01650 82401 2190 0009 2190 0016 2190 0027 3160 0092 0590 1868 1400 0611 0380 1482 01650 00203 2950 0054 3050 0893 HP 1652B 1653B Service Manual oon ao 00 LO Oo 0O A eb ob mb m ob Ol lo N as aoono Table 5 2 Replaceable Parts List SYSTEM BOARD ASSEMBLY 80 CHANNEL 1652B SYSTEM BOARD ASSEMBLY 32 CHANNEL 1653B KEYBOARD CIRCUIT BOARD ASSEMBLY MONITOR ASSEMBLY ROTARY
118. l appear on screen y The RS 232 C loopback connector is an accessory supplied with the Note uf HP 1652B 1653B 3 Move the cursor to Single test or Repetitive test and press SELECT 4 If you are running repetitive tests press the front panel STOP key when you want to discontinue the test The number of runs and failures will be displayed in the menu Self Tests HP 1652B 1653B 6B 4 Service Manual 5 Toreturn to HP 1652B 1653B Self Tests menu move the cursor to Done and press SELECT BNC Self Test The BNC self test verifies the functionality of the internal BNC trigger circuitry 1 In HP 1652B 1653B Self Tests menu move the cursor to BNC and press SELECT A menu will appear with a description of the test the number of runs and failures for the selected test and fields to select Single test Repetitive test or Done Move the cursor to Single test or Repetitive test and press SELECT The message Running BNC Test appears on screen while the instrument is performing the test When the test 1s finished the message BNC Test complete will appear on screen If you are running repetitive tests press the front panel STOP key when you want to discontinue the test The number of runs and failures will be displayed in the menu Toreturn to HP 1652B 1653B Self Tests menu move the cursor to Done and press SELECT Keyboard Self The Keyboard self test verifies the key closures and knob operation on the front T
119. le to male Oty 2 2 Ohms 25 Watts A Adjustments Table 1 1 Recommended Test Equipment Continued Recommended Model Use HP Part Number P 1250 0082 HP Part Number 1251 2277 HP 10100C 54503 61604 HP 10503A HP 11000 60001 HP 11500B HP Part Number 1250 0781 HP 1250 0216 HP Part Number 0811 1390 T Troubleshooting HP 1652B 1653B Service Manual Contents Section 2 Installation latod Onea 22222 adie E p Dao MPO NM Giana ete mee Papeete ad iue 2 1 Saletv Considerations ces ovs ues ceci d rapida 2 1 Initial InSBectlof o5 nd coe eR Ves ES A aiu S AES wa 2 1 Operating Disk Installation o ooooocooooconcrrorcrarconacns s 2 1 Power Requirements ci onov Ex Y a se Mese eden de adt es 2 1 Line Voltage Selectioitu usto ne Rubi vsum p ppm eite ats 2 2 Power Cable tania n eret des ba be d adt dau bae d Ot et En 2 3 Applying POWEE ocio a Oe 2 3 User Interface 225 Sib aches cae e e onda Ce baked heer e taie desti 2 5 HP IB Inte facing cs eee sex eRbrbs E eee ks 2 5 HP IB Address Selection 2 aeos prn etie aae A atu ie nd 2 6 Bp8 222 C Interface iban te eod 2 1 R5 232 C COn PAra UON ee y eb ue hr oa ES ER eei apud e d es 2 7 Degaussing the Display T 2 9 Operating Environment m 2 9 Storape and Shipment scr opis tees Pep Haake eee e aee 2 9 Taveine Or Ser VICO siria 2 9 Original Packa ine ooo ie Etro a nv en Dive Abi 2 0 Other Pa
120. ler ooo ee Coste that tactic heads anew ded 6A 5 RS 232 C Interact ione a 6A 5 PIP IB Interlace isidro nis ECCE 6A 5 Logic Analyzer Theory of Operation ooooconcocoocooromommmo oo 6A 7 Data ACGUisilOn sidad P EP dads vnda bea ona Bac ea qd buon 6A 7 ATEO COHLDOL ss rice Roe aret bac pee Qe ubt bacs d NM Ee e ae 6A 7 MEMORY aestu dba Pado a aiat o ados 6A 8 Oscilloscope Theory of Operation 0 0 cece cece cece ee eees 6A 9 Attenuator Preamps ooo oos wea VESSELS NA d Ra ad 6A 9 POSEAAGDDIIDIGE Di E id e aie a ibd Soe eee 6A 9 ADC and FISO Memory 2 5 esae dada da PUE 6A 9 A avs ee tose ea DS ede ess Be eng tate etie s 6A 9 Time Base sic irritada bs so eee 6A 10 Fine Interpolator cese beh os ie Sete Rod ati a 6A 10 Probe Compensa nseni er op Ree he PLIN EP enu vb 6A 10 Digital Interac nessa tue acean e doo arida desees arie apt d 6A 10 Analog Interlace A ood OR RR Us he DE Rd Padua ed RR 6A 10 I eee Self Tests IntrOdUC HOD us sus etre t bees raten arque Rn Mta pda beak oe qe 6B 1 Power Up Self Tests ooooooooommooo nist agite E eee ete 6B 1 Selectable Self Tests oos nei eroi bob Ee SE edi vadit bd 6B 2 Selecting the Self Tests Menu 1 uero RR ees t tira Dukes Cr ite On 6B 2 Analyzer Data Acquisition Self Test ooooooooooooooromommoo 6B 3 Scope Data Acquisition Self Test 2 cece cee eee eee 6B 4 A SCI TEST eh oh onion acon Gane ahs Bnet ut etter aes as ee aces td 6B 4 BNC Sell Vest
121. lf Tests menu move the cursor to Done and press SELECT ROM Self Test The ROM self test verifies the operation of system ROM 1 In HP 1652B 1653B Self Tests menu move the cursor to ROM and press SELECT A menu will appear with a description of the test the number of runs and failures for the selected test and fields to select Single test Repetitive test or Done 2 Move the cursor to Single test or Repetitive test and press SELECT The message Running ROM Test appears on screen while the instrument is performing the test When the test 1s finished the message ROM Test complete will appear on screen 3 If you are running repetitive tests press the front panel STOP key when you want to discontinue the test The number of runs and failures will be displayed in the menu 4 To return to HP 1652B 1653B Self Tests menu move the cursor to Done and press SELECT Disk Drive Self The Disk Drive self test verifies the functionality of the key elements of the internal Test disk drive system 1 In HP 1652B 1653B Self Tests menu move the cursor to Disk Drive and press SELECT A menu will appear with a description of the test the number of runs and failures for the selected test and fields to select Single test Repetitive test or Done uc There must be a formatted disk in the disk drive to successfully run the Disk Drive Note wj self tests 2 Move the cursor to Single test or Repetitive test and press SELECT The message
122. m the PC board on the keyboard assembly 11 Separate the PC board keypad and keyboard panel label RPG CABLE RPG PC BOARD RIBBON CABLE KEYPAD KEYBOARD PANEL LABEL KNOB 01653606 Figure 6D 5 Exploded view of the Keyboard Assembly 12 The knob is force fitted on the RPG shaft To remove the knob pull it straight off 13 Remove the 3 8 inch nut from the RPG 14 Remove the RPG from the keyboard panel 15 The keyboard label uses a self stick adhesive If the label must be removed carefully peel it off 16 Replace the keyboard assembly by reversing this procedure a ee When you reinstall the top cover insert the four screws on the sides of the cover Note first while making sure the cover fits into the grooves of the instrument cabinet Then insert the six screws in the top of the cover A ___ E _ _ 444 HP 1652B 1653B Assembly Removal and Replacement Service Manual 6D 9 ae Removal and When necessary refer to other removal procedures Rep lacement of 1 Turn off the instrument and disconnect the power cable the Fan 2 Remove the six screws from the top and the two screws from each side of the instrument s top cover 3 Lift off the top cover 4 Remove the Rear Panel Assembly 5 Pull the rear panel out until the fan clears the instrument cabinet It is not necessary to completely remove the rear panel 6 For reassembly note the orientation of t
123. manufactured after the printing of this manual may have a serial number prefix that is not listed on the title page This unlisted serial prefix indicates the instrument is different from those described in this manual The manual for this newer instrument is accompanied by a Manual Changes supplement This supplement contains change information that explains how to adapt the manual to the newer instrument In addition to change information the supplement may contain information for correcting errors in the manual To keep this manual as current and accurate as possible Hewlett Packard recommends that you periodically request the latest Manual Changes supplement The supplement for this manual is identified with the manual print date and part number both of which appear on the manual title page Complimentary copies of the supplement are available from Hewlett Packard E COT7C OO P hA 9 Safety This product is a Safety Class 1 instrument provided with a protective earth Considerations terminal Review the instrument and manual for safety markings and instructions before you begin operating this instrument Specific warnings cautions and instructions are placed wherever applicable throughout the manual These precautions must be observed during all phases of operation service and repair of the instrument Failure to comply with these precautions or with specific warnings elsewhere in this manual violates safety standards
124. mbly to fall forward from the front panel Separate the elastomeric keypad and keyboard panel from the PC board Short the PC board trace with a paper clip or screwdriver of the non operating key and look for an appropriate response on the display keypad keyboard If the display responds as if the key were pressed replace the elastomeric If the display does not respond as if the key were pressed replace the The RPG connector has a TTL pulse on pins 1 and 3 when the knob is being turned Pin 5 of the connector is 5 V The ROW scan signal 1s a low duty cycle pulse at approximately 60 Hz It is continually present on pins 14 through 20 of the keyboard cable Because of the resistance of the keypad contacts the signal does not appear the same on the COLUMN data pins when keys are pressed Refer to the following table for signals going to and from the keyboard Troubleshooting 6C 14 Table 6C 3 Keyboard Connector Voltages and Signals PIN SIGNAL GROUND COLUMN 6 Data GROUND RPG DIRECTION COLUMN 5 Data COLUMN 3 DATA COLUMN 1 DATA ROW 5 Scan ROW 3 Scan ROW 0 SCAN PIN SIGNAL GROUND 5 V DIGITAL RPG CLICKS N C COLUMN 4 Data COLUMN 2 DATA ROW 4 Scan ROW 2 Scan ROW 1 Scan ROW 6 SCAN HP 1652B 1653B Service Manual Disk Drive Use the following steps to check the disk drive voltages voltages CHECK 1 Remove the top cover of the instrument 2 Run the
125. mize loading The Note ap ground lead must be connected to ensure accurate test results HP 1652B 1653B Performance Tests Service Manual 3 11 2 Adjust the pulse generator for the output in figure 3 12 DATA OUTPUT A pees CLOCK OUTPUT B 8 2V 10S h V 01650W11 Figure 3 12 Waveform for Data Test 2 Setting for HP 8161A Parameter Output A Output B Input Mode Norm Period PER HP 1652B 28 5 ns HP 1653B 40 0 ns Width WID 30 ns 30 ns Leading Edge LEE 1 ns 1 ns Trailing Edge TRE 1 ns 1 ns High Level HIL 3 2 V 3 2 V Low Level LOL OV OV Delay DEL Ons Ons Output Mode ENABLE ENABLE 3 Assign the pod under test to Analyzer 1 in the System Configuration as in the previous test figure 3 5 4 In the State Format Specification assign the Clock Period to lt 60 ns and assign the rising edge of the J clock to the Clock field Also assign the lower 8 channels of the pod under test to a label as in figure 3 13 MACHINE j State Format Specification Specify Symbols Clock Clock Period Activity gt Label Pol 15 Figure 3 13 Format Specification for Data Test 2 Performance Tests HP 1652B 1653B 3 12 Service Manual i Note V HP 1652B 1653B Service Manual 5 Setthe State Trace Specification without sequencing levels and set Count to Off as in figure 3 14 HACHINE_1 State Trace Specification Trece mode Single Sequence Levels While
126. n Flowcharts HP 1652B 1653B Service Manual The trouble isolation flowcharts are the troubleshooting guides Start there when repairing a defective instrument The flowcharts refer to other tests tables and procedures to help isolate troubles Disassembly procedures are included in section 6D to direct you in replacing faulty assemblies The circled numbers on the charts indicate the next chart to use for isolating a problem Troubleshooting 6C 1 START PERFORM POWER UP SELF TEST APPLY POWER TEST AUTOMATIC NO e CHART 2 YES POWER SUPPLY VOLTAGES OK IS CRT DISPLAYING ANYTHING NO YES IS CRT DISPLAY 4 CORRECT CHART 4 YES DOES KEYBOARD WORK 2 CHART YES lt 5 CHART 6 DOES DISK DRIVE WORK YES 01652B10 o CHART 3 DOES NO DATA ACQUISTION FUNCTION YES DOES RS 232 C FUNCTION NO YES DOES HB IB 3s FUNCTION YES DOES NO EXTERNAL TRIGGERING FUNCTION YES NO DOES OSCILLOSCOPE FUNCTION YES END Figure 6C 1 Primary Troubleshooting Flowchart Troubleshooting ec 2 CHART 1 CHART 7 B CHART 8 CHART 9 CHART 16 CHART 11 HP 1652B 1653B Service Manual c CHART 1 CHART 2 TURN POWER OFF AND CHECK FUSE POSITION RATING AND OPERATION NO REPLACE FUSE TURN ON POWER AND CHECK POWER SUPPLY VOLTAGES
127. ng on and states with state counting on Transitional Timing Mode A sample is stored in acquisition memory only when the data changes A time tag stored with each sample allows reconstruction of a waveform display Time covered by a full memory acquisition varies with the number of pattern changes in the data Sample Period 10 ns Maximum Time Covered By Data 5 000 seconds Minimum Time Covered by Data 10 24 us Glitch Capture Mode Data sample and glitch information is stored every sample period Sample Period 20 ns to 50 ms in a 1 2 5 sequence dependent on seconds division and delay settings Memory Depth 512 samples channel Time Covered by Data Sample period X 512 Waveform Display Sec div 10 ns to 100 s 0 01 resolution Screen Delay 2500 s to 2500 s The presence of data is dependent on the number of transitions in data between the trigger and trigger plus delay transitional timing Accumulate The waveform display is not erased between successive acquisitions Hardware Delay 20 ns to 10 ms Overlay Mode Multiple channels can be displayed on one waveform display line The primary use is to view a summary of bus activity Maximum Number Of Displayed Waveforms 24 Time Interval Accuracy Channel to Channel Skew 4 ns typical General Information 1 11 Measurement and Display Functions General Information 1 12 Sample Period Accuracy 0 01 of sample period Time Interval Accuracy
128. nnel 2 waveform Performance Tests HP 1652B 1653B 3 48 Service Manual HP 1652B 1653B Service Manual 4 Set Input to CH 1 V Div to 100 mV Offset to 0 V Probe to 1 1 Impedance to 50 Ohms and s Div to 5 0 ns as in figure 3 59 Scope Channei Input V Div 100 0 mV Offset Probe i 1 Impedance 50 Onms Preset USER s biv Bare Figure 3 59 Channel Menu Configuration 5 Press DISPLAY and set Display to Normal Connect dots On and Grid On 6 Press TRACE TRIG and set the Run mode to Repetitive and trigger Level to 0 V as in the previous figure 3 51 7 Set the signal generator to 100 MHz at approximately 150 mV 8 Press RUN and use the Level and Delay to center the rising edge of the waveform as close as possible to center screen as in figure 3 60 It may be necessary to use Offset to center the signal symmetrically about the horizontal axis Scope Trigger Calibration Source Run mode Slope Ruto Trig 0n Delay Armed by Figure 3 60 Centering the Waveform 9 Press STOP then press DISPLAY Set Display to AVG 16 10 Press RUN and when the waveform has stabilized at center screen press STOP Performance Tests 3 49 Performance Tests 3 50 11 Use the following table for the next steps Delay 10 ns 100 ns 500 ns Tolerance Limits z 0 601 ns 9 399 to 10 601 ns 0 610 ns 99 30 to 100 61 ns 0 650 ns 499 35 to 500 65 ns 12 Select Delay and enter the delay value listed on the f
129. nsists of the front panel keys the KNOB and the display The interface allows you to configure the logic analyzer each analyzer machine within the logic analyzer and the oscilloscope in the logic analyzer It also displays acquired data and measurement results Using the front panel interface is a process of selecting the desired menu with menu keys placing the cursor on the desired field within the menu by rotating the KNOB displaying the field options or current data by pressing the SELECT key e selecting the desired option by rotating the KNOB or entering new data by using the KNOB or the keypad e Starting and stopping data acquisition by using the RUN and STOP keys For additional information on the user interface refer to the HP 1652B 1653B Front Panel Operation Reference manual Ponti PR LIT I IIIIIIIII IIIIIIIIZ HP IB The Hewlett Packard Interface Bus HP IB is Hewlett Packard s implementation Interfaci ng of IEEE Standard 488 1978 Standard Digital Interface for Programming Instrumentation HP IB is a carefully defined interface that simplifies the integration of various instruments and computers into systems The interface makes it possible to transfer messages between two or more HP IB compatible devices HP IB is a parallel bus of 16 active signal lines divided into three functional groups according to function Eight signal lines called data lines are in the first functional group The data lines are used
130. ntrolled by the CPU portion of the Main Assembly System control provides synchronization and pixel information Main Assembly The Main Assembly contains the logic analyzer acquisition system and system control circuitry It also provides interfaces for the Power Supply Assembly CRT Monitor Assembly keyboard RS 232C and HP IB The input to the Main Assembly is from any or all of the data acquisition pods which exit the rear panel The user interface is from the front panel keyboard or with a controller via the HP IB or RS 232C connector on the rear panel A more detailed theory of the logic analyzer circuitry follows block level theory Central The CPU is a 68000 P10 microprocessor with addressing capability of 16 Processing Unit megabytes 23 address lines 16 data lines The CPU receives its clock 10 MHz CPU from the TCL Timing Control Logic The TCL circuitry consists of programmable array logic PALs various logic gates and miscellaneous circuitry for arbitrating between display and refresh requests of display and system RAM The PALs and arbitration circuitry are synchronized with a 20 MHz clock The rest of the circuitry is asynchronous The signals generated by the TCL provide all timing for the CPU The CPU drives the read write line and the address and data strobes The CPU supplies a 2 5 MHz enable clock for synchronization with the CRT Controller CRTC Oscilloscope The Oscilloscope Assembly contains the oscilloscope acqu
131. o events Automatic Search Searches for a specified absolute or percentage voltage level at a positive or negative edge with count adjustable from 1 to 1024 Auto Search Statistics Displays mean maximum and minimum values for elapsed time from X to O markers for multiple runs The number of valid runs and total number of runs are also displayed Trigger Level Marker A horizontal trigger level marker is displayed in the Trace Trigger menu only Automatic Measurements The following pulse parameter measurements can be performed automatically Frequency Period V p p Rise time Fall time Preshoot Overshoot pulse width pulse width Grid Selectable On Off Setup Aids Autoscale Automatically sets the vertical and horizontal ranges offset and trigger levels to display the input signals This requires an amplitude above 10 mV peak and a frequency between 50 Hz and 100 MHz HP 1652B 1653B Service Manual Preset Scales the vertical range offset and trigger level to predetermined values for displaying ECL or TTL waveforms ical R Trigger TTL 15 V 25V 1 60 V ECL 500 mV 1 3 V 1 3 V Values when Probe 10 1 Calibration Offset attenuation gain trigger level delay and set to defaults Probe Compensation Source The external BNC supplies a square wave signal of approximately 400 mV to 900 mV at approximately 1 25 kHz E b OO A m Interactive Measurements Acquisition
132. ock by gt 50 ns Clock Pulse Width 10 ns at threshold Setup Time Data must be present prior to the clock transition z 10 ns Hold Time Data must be present after the rising clock transition 0 ns Data must be present after the falling clock transition 0 ns HP 1653B Data must be present after the falling L clock transition 0 ns HP 1652B Data must be present after the falling J K M and N clock transition 1 ns HP 1652B Minimum Detectable Glitch 5 ns wide at the threshold gg 4 lt 4 O OO4 O Logic Analyzer Operating Characteristics Probes HP 1652B 1653B Service Manual The following operating characteristics are not specifications but are typical operating characteristics for the HP 1652B 1653B logic analyzer These characteristics are included as additional information for the user Input RC 100 KQ 2 shunted by approximately 8 pF at e probe tip Dynamic Range 10 volts about the threshold TTL Threshold Preset 1 6 volts ECL Threshold Preset 1 3 volts Threshold Range 9 9 to 9 9 volts in 0 1 volt increments Threshold Setting Threshold levels may be defined for pods 1 and 2 individually HP 1653B Threshold levels may be defined for pods 1 2 and 3 on an individual basis and one threshold may be defined for pods 4 and 5 HP 1652B General Information 1 7 Measurement Configurations State Analysis General Information 1 8 Minimum Input Overdrive 250 mV or 3046
133. ock hazard that could result in personal injury e Whenever it is likely that the protection has been impaired the instrument must be made inoperative and be secured against any unintended operation e Only fuses with the required rated current voltage and specified type normal blow time delay etc should be used Do not use repaired fuses or short circuited fuseholders To do so could cause a shock or fire hazard e Donotoperate the instrument in the presence of flammable gasses or fumes Operation of any electrical instrument in such an environment constitutes a definite safety hazard e Donotinstall substitute parts or perform any unauthorized modification to the instrument e Adjustments described in the manual are performed with power supplied to the instrument while protective covers are removed Energy available at many points may if contacted result in personal injury e Any adjustment maintenance and repair of the opened instrument under voltage should be avoided as much as possible and when inevitable should be carried out only by a skilled person who is aware of the hazard involved e Capacitors inside the instrument may still be charged even if the instrument has been disconnected from its source of supply Safety Symbols Instruction manual symbol The product will be marked with this symbol when it is necessary for the user to refer to the instruction manual in order to protect against damage to the product
134. of design manufacture and intended use of this instrument Hewlett Packard assumes no liability for the customer s failure to comply with these safety requirements General Information HP 1652B 1653B 1 2 Service Manual eee Product The HP 1652B 1653B logic analyzers are general purpose instruments featuring Descri ption measurement capabilities in all three domains of interest to the digital system designer Analog Timing and State Each of these domains is available to the user separately or in an interactive combination The HP 1652B includes an 80 channel 35 MHz state 100 MHz timing logic analyzer selectable in 16 channel groupings with a 2 channel 100 MHz 400 Msample s digitizing oscilloscope The HP 1653B includes an 32 channel 25 MHz state 100 MHz timing logic analyzer also selectable in 16 channel groupings with a 2 channel 100 MHz 400 Msample s digitizing oscilloscope Both analyzers can be configured as two independent state analyzers or one state and one timing analyzer Two channels of oscilloscope measurement can be added to any configuration Some of the main features of the analyzer include the following e Simultaneous state state or simultaneous state timing analysis e Time interval number of states pattern search minimum maximum and average time interval statistics e Transitional timing to store data only when there is a transition e Clock qualifiers storage qualification time and number of sta
135. of the input amplitude whichever 1s greater Maximum Voltage 40 volts peak Maximum Power Available Through Cables 600 mA at 5V per cable 2 amp 5V per HP 1652B 1653B Analyzer Configurations Analyzer 1 Analyzer 2 Timing Off Off Timing State Off Off State Timing State State Timing state State Off Off Channel Assignment Each group of 16 channels a pod can be assigned to Analyzer 1 Analyzer 2 or remain unassigned The HP 1652B contains 5 pods the HP 1653B contains 2 pods Memory Data Acquisition 1024 samples channel Trace Specification Clocks Five clocks HP 1652B or two clocks HP 1653B are available and can be used by either one or two state analyzers at any time Clock edges can be ORed together and operate in single phase two phase demultiplexing or two phase mixed mode The clock edge is selectable as positive negative or both edges for each clock Clock Qualifier The high or low level of four ORed clocks HP 1652B or one clock HP1653B can be ANDed with the clock specification Setup time 20 ns hold time 5 ns Pattern Recognizers Each recognizer is the AND combination of bit 0 1 or X patterns in each label Fight pattern recognizers are available when one state analyzer is on Four are available to each analyzer when two state analyzers are on Range Recognizers Recognizes data which 1s numerically between or on two specified patterns ANDed combination of zeros and or ones One
136. onnect the HP 1652B 1653B and test equipment as in figure 3 43 INPUT MULTIMETER POWER SUPPLY LOGIC ANALYZER 01652E 14 Figure 3 43 Setup for Voltage Measurement Accuracy 2 Connect the power supply to Channel 1 of the HP 1652B 1653B oscilloscope 3 In the System Configuration menu turn both State Timing Analyzers off and turn the oscilloscope on as shown in the previous test figure 3 42 HP 1652B 1653B Performance Tests Service Manual 3 37 4 Unassign all of the pods from the analyzers as shown in figure 3 44 Refer to steps a through c if you are unfamiliar with menus System Configuretion finalyzer 1 Analyzer 2 Oscilloscope Type Off Type inesse ts Anelyzer ods Figure 3 44 System Configuration a Move the cursor to an assigned pod and press SELECT b Move the cursor to Unassigned and press SELECT c Repeat steps a and b for all assigned pods 5 Press the FORMAT CHAN key and turn off channel 2 by deleting the channel 2 waveform as in figure 3 45 Refer to steps a and b if you are unfamiliar with menus Scope Channel Input V Div 1 500 V Offset 2 500 V Probe Impedance Ohm Preset s D1v Delay Insert weveform Maverorm on Figure 3 45 Deleting Channel 2 a Move the cursor to CH 2 at the left side of the display and press SELECT b Move the cursor to Delete waveform and press SELECT Performance Tests HP 1652B 1653B 3 38 Service Manual HP 1652B 1653B Serv
137. oommommmmommo r oo 6C 1 Power Supply Voltages Check 0 cece cece cece cece cece eeeees 6C 12 CRT Monitor Signals Check ooooooooccocroroommmmmmm ooo 6C 13 Keyboard Signals Check 35 aint tcara aav ibam VERSUM 6C 14 Disk Drive Voltages Check caricia adas 6C 15 Troubleshooting Auxiliary Power ccc cece cece cece ce een 6C 16 6C Troubleshooting Introduction Caution y This section provides troubleshooting information for the HP 1652B 1653B Logic Analyzer Troubleshooting consists of flowcharts and signal level tables The troubleshooting information is provided to isolate a faulty assembly When a faulty assembly has been located the disassembly assembly procedures in section 6D help direct replacement of the assembly Self test descriptions and instructions are provided in section 6B The effects of ELECTROSTATIC DISCHARGE can damage electronic components Use grounded wriststraps and mats when performing any kind of service to this instrument Safety Warning Wy Read the Safety Summary at the front of this manual before servicing the instrument Before performing any procedure review it for cautions and warnings Maintenance should be performed by trained service personnel aware of the hazards involved for example fire and electric shock When maintenance can be performed without power applied the power cord should be removed from the instrument Trouble Isolatio
138. or to User defined with the front panel knob and press SELECT c Use the front panel keys to enter the value 9 9 V Then move the cursor to Done and press SELECT 7 The voltmeter readout should indicate a voltage value within the range of 975 V to 1 005 V 990 V 0 015 V 8 Set the User defined pod threshold of the pod assigned in step 6 to 9 9 V 9 Note voltmeter readout The voltage reading should be within the range of 4 975 V to 1 0005 V 990 V 0 015 V 10 If either voltage reading is not within the given range use the following procedure to adjust the threshold level a Turn off the instrument and disconnect the power cable Never attempt to remove or install any assembly with the instrument ON or the power cable connected This can result in component damage b Remove the oscilloscope assembly by following the procedure Removal and Replacement of the Oscilloscope Assembly in section 6D c Loosen the two screws that hold the rear bracket on the oscilloscope assembly support panel until the bracket moves freely d Remove the support panel by carefully tilting the rear of the panel up and lifting the panel out through the top of the instrument cabinet Make sure the metal tabs on the front of the support panel clear the front panel e Reconnect the power supply using the power supply cable HP part number 54503 61604 f Reconnect the disk drive assembly cable to the disk drive g Reinstall t
139. oria ROI E RR DeL peii iai ee RH eens 6B 5 Keyboard Sell Pest dubios dee esu eerie Go git iate p as din 6B 5 HP 1652B 1653B Service Manual Contents 3 Section 6C RAM Sel Test cuanta Ra 6B 5 ROM Sell TES ria icon 6B 6 Disk Drive Seu Test simi ia 6B 6 Cycle Throuta Tesis era aia dada odos 6B 7 On Aw O O P PCC Troubleshooting Introduction s voro is RE PE Dep au adea 6C 1 E A ooo E pES a a bad hus T mosse eR dus rdiet 6C 1 Trouble Isolation Flowcharts oooooooonoorcrorrommr rro 6C 1 Power Supply Voltages Check e exuere toiin IE n Ex PA EE EA UA 6C 12 CRT Monitor Signals Check eiii saben qd be IARE NE Ep EP 6C 13 Keyboard Signals Check cantas dh nube mox pd PR NP Ae 6C 14 Disk Drive Voltages Check i oesuopuasie n Piso tee evi 6C 15 Troubleshooting Auxiliary Power 0 2 c eee eee e eee eens 6C 16 MEAN QA QA AAA Section 6D Contents 4 Assembly Removal and Replacement Introductions cocos a its 6D 1 Removal and Replacement of the Rear Panel Assembly 6D 3 Removal and Replacement of the Disk Drive ooooocoooomoooo 6D 4 Removal and Replacement of the Power Supply Assembly 6D 5 Removal and Replacement of the Oscilloscope Assembly 6D 5 Removal and Replacement of the Attenuators ooooocoocoommmmm o 6D 7 Removal and Replacement of the Keyboard Assembly 6D 8 Disassembling the Keyboa
140. plexed clocking only the lower eight bits of each pod are used OSCILLOSCOPE PULSE GENERATOR LOGIC ANALYZER Performance Tests 3 24 500 SX M ercure 2s CLK BIT DATA BITS B De Qma oou Figure 3 26 Setup for Data Test 6 01650849 HP 1652B 1653B Service Manual 2 Adjust the pulse generator for the output in figure 3 27 4 60NS 3 2V M vs CLOCK OUTPUT B QN a 129NS 3 2Vv DATA OUTPUT A QV 40NS W 60NS m 4 20NS 01650W14 Figure 3 27 Waveform for Data Test 6 Setting for HP 8161A Parameter Output A Output B Input Mode Norm Period PER 120 ns Width WID 60 ns 10 ns Leading Edge LEE 1 ns 1ns Trailing Edge TRE 1 ns 1ns High Level HIL 32V 3 2V Low Level LOL OV 0V Delay DEL 40 ns ns Double Pulse DBL 60 ns Output Mode ENABLE ENABLE 3 Assign the pod under test to Analyzer 1 in the System Configuration as in the previous figure 3 5 4 Set up the State Format Specification as in figure 3 28 Assign the falling J clock as the Master Clock and the rising J clock as the Slave Clock Refer to steps a through d if you are unfamiliar with the menus MACHINE State Format Specification Specify Symbols Masier Clock Slave Clock Clock Period Pod 1 Activity dst Coni Lebel Pol 7 07 POD 1 Consranenenenenes Figure 3 28 Format Specification
141. provided for the convenience of the user The Input Resistance Test is optional The input resistance 1s not specified in the instrument performance specifications The values given are typical Results are not recorded in the test record Characteristic 1 M amp 1 and 50 Q 1 Equipment Required Digital Multimeter HP 3478A BNC Cable 2 000 c ccc eee eee HP 10503A BNC Tee M ff 24cresewsd taeda VERTES HP 1250 0781 BNC f to Banana m Adapter 2 HP 1251 2277 Procedure 1 Set up the multimeter to make a four wire resistance measurement 2 Use the BNC to banana adapters to connect one end of each BNC cable to the four wire resistance connections on the multimeter Then connect the free ends of the cables to the BNC tee as in figure 3 41 OSENSE INPUT LOGIC ANALYZER OSCILLOSCOPE MULTIMETER 1632B7 T0338 01652E 13 Figure 3 41 Setup for Input Resistance Test Performance Tests 3 35 3 Connect the male end of the BNC tee to the channel 1 input of the HP 1652B 1653B oscilloscope 4 In the System Configuration menu turn both State Timing Analyzers off and turn the oscilloscope on as in figure 3 42 Refer to steps a through d if you are unfamiliar with menus System Conf 1guration Analyzer 1 Analyzer 2 Oscilloscope Type OT Type nessigneg Analyzer Figure 3 42 System Configuration for Input Resistance a Move the curso
142. r to the Type field of Analyzer 1 and press the SELECT key b Set the analyzer Type to Off using the cursor and SELECT key c Repeat steps a and b for Analyzer 2 d Move the cursor to the On Off field of the Oscilloscope and press the SELECT key to turn the oscilloscope On 5 Press the TRACE TRIG key and use the cursor and SELECT key to set the Run Mode to Single 6 Press the FORMAT CHAN key and use the cursor and SELECT key to set Input to CH 1 7 Set the Impedance to 1 MOhm and press RUN The multimeter should read 1 MQ 10 kQ 8 Set the Impedance to 50 Ohms and press RUN The multimeter should read 50 Q 0 5 Q 9 Repeat steps 3 6 7 and 8 for channel 2 Failure of this test indicates a faulty attenuator if resistance is out of specifications Note The oscilloscope assembly also may be at fault if input resistance cannot be changed See troubleshooting in section 6C for more information Performance Tests HP 1652B 1653B 3 36 Service Manual Voltage Description Measurement Accuracy Test This test verifies the voltage measurement accuracy of the instrument Specification Gain Accuracy Offset Accuracy ADC Resolution Equipment Required Power Supply cs aet PR SURE rea HP 6114A Digital Multimeter HP 3478A BNC Cable edes EC pe is HP 10503A BNC f to Banana m Adapter HP 1251 2277 Banana m to Banana m Cable 2 HP 11000 60001 Procedure 1 C
143. rate reference and filters on the outputs It controls channel offsets and trigger levels Theory of Operation HP 1652B 1653B 6A 10 Service Manual L q9 AS A ere Ee a RO AAA AS RD SISO qdnodg T IPAD RE ac ea 3S9 L JJOS SAM NSI I ISOL IPS WOU LLLI E ISOL JI S WVA CR qoos naue ee Be ders 159 1 JIPS preoghoy CII E ee S fieelantig SOL JOS DNA pug PARO Rem a Pee A eae qud eee SOJT JIPS D ZET SU Fe a a a 159 1 HS uonrsmboy ejeq odoog e e A ae 1S3 L HS uonsmboy ejeq Ioz eguy Ae sumet hoodies ieu a sues MA e nuojA SISAL JAS M ZWA O EN A a ine til SIS L JOS APAPS OI sjso Jos dy 19m04 go ae AA re ee e uononponu SIS9 HAS G9 uonoes BED ESSENCE IEEE MUNI IMEEM IEEE U9 U04 6B Self Tests Introduction This section provides information on the power up self tests and extended self tests of the HP 1652B 1653B All of these self tests may be performed without access to the interior of the instrument Powe r Up The power up self tests are automatically performed upon applying power to the Self Tests instrument The revision number of the operating system is given in the upper right corner of the screen during the power up self tests As each test is completed either passed or failed is printed in front of the name of each test in the following manner PERFORMING POWER UP SELF TESTS passed ROM test passed RAM test passed Interrupt test passed Display test passed Keyboard test passed Acquisition test passed
144. rd Assembly s 6D 9 Removal and Replacement of the Fad oooocoooccoommmmm 6D 10 Removal and Replacement of the Main Assembly 6D 10 Removal and Replacement of the CRT Monitor Assembly 6D 11 Removal and Replacement of the Feet Tilt Stand 6D 12 HP 1652B 1653B Service Manual Contents EXTERNER NC ta lr MEME MM C UNE EU Section 1 General Information o PP te rbd Ida Ege dp Ed dde es 1 1 Instruments Covered by this Manual 0 cee cece cece eee eens 1 2 Safety Considerations So vro Rer a deer qa epe UP ETUR deed 1 2 Product DESCHpIOD 29 2d 620 eee CE epi RD E Pep EX Pu aM 1 3 Accessories SUDDIIGU i ooo osa SS ers AAA 1 4 Accessories Available tette re oes eR qe epe amd Metus able ue 1 5 Lomc Analyzer SPecHica OS adobe UE ei RERO eU pue adips 1 7 A RD Ee Po reno Siete nee eee etes aita a aus 1 7 State MOGB zodiacal 1 7 Timine Mode eost ed E anii e 1 7 Logic Analyzer Operating Characteristics 0c cece eee eee e eee eeees 1 7 PODS ui inpet udo wane eae meee Sean cre 1 7 Measurement Configurations 0c cece cece eee nnn 1 8 Slate Analysis Scu o dot e eta s dada dart ruv iuo pida iene mor REDE 1 8 Timing Analysis sad uS cS Measurement and Display Functions ooooocococmommmommomooo 1 12 Oscilloscope Specifications c ooo cdnsadenbad sw tia eR ve d nea E sages 1 15 Vertical nerd ds arcada Ride ed
145. repetitive Disk Drive Self Test 3 Remove the disk drive cable from the disk drive 4 Check the disk drive cable for the voltages listed in the following table n SIGNAL DESCRIPTION om SIGNAL DESCRIPTION CHANGE RESET 5 V DISK CHANGE 5 V IN USE 5 V DRIVE SELECT3 45 V 5 V INDEX 5 V DRIVE SELECTO 5 V DRIVE SELECT1 GROUND DRIVE SELECT2 5 V GROUND MOTOR ON GROUND DIRECTION GROUND STEP GROUND WRITE DATA GROUND WRITE GATE GROUND TRACK 00 GROUND WRITE PROTECT 12 V READ DATA 12 V HEAD SELECT 12 V READY W Do not match the arrows of the cable and connector when connecting the disk Caution drive cable to the disk drive The connector of the disk drive is marked with an arrow at pin 34 of the connector The end of the disk drive cable is marked at pin 1 of the cable Matching the arrows will damage the disk drive HP 1652B 1653B Troubleshooting Service Manual 6C 15 C _o oo _ O C 9 Troubleshooti ng The 5 volt auxiliary power line is protected by a current limiting circuit If the Auxiliary Power current on pins 1 and 39 exceeds 2 3 amperes the circuit will open When the short is removed the circuit will reset in approximately 20 ms If you suspect a problem with this circuit remove all loads from pins 1 and 39 and measure the voltage between these pins and ground pins 2 and 40 with a voltmeter There should be 5 volts at pins 1 and 39 after the 20 ms reset time
146. ress SELECT A menu will appear with a description of the test the number of runs and failures for the selected test and fields to select Single test Repetitive test or Done pa 2 Move the cursor to Single test or Repetitive test and press SELECT The message Running Scope Data Acquisition Test appears on screen while the instrument is performing the test When the test is finished the message Scope Data Acquisition Test complete will appear on screen 3 If you are running repetitive tests press the front panel STOP key when you want to discontinue the test The number of runs and failures will be displayed in the menu 4 To return to HP 1652B 1653B Self Tests menu move the cursor to Done and press SELECT RS 232 C Self Test The RS 232 C self test verifies the functionality of the RS 232 C driver and continuity of the RS 232 C data paths Equipment Required RS 232 C Loopback Connector 01650 63202 Procedure 1 In HP 1652B 1653B Self Tests menu move the cursor to RS 232 C and press SELECT A menu will appear with a description of the test the number of runs and failures for the selected test and fields to select Single test Repetitive test or Done 2 Connect the RS 232 C loopback connector to the rear panel RS 232 C receptacle The message Running RS 232C Test appears on screen while the instrument is performing the test When the test 1s finished the message RS 232C Test complete wil
147. ront of the test Selecting the Self The self tests may be invoked from any menu by pressing the front panel I O key Tests Menu The pop up I O menu appears on screen with the following choices Done Print Screen Print All Disk Operations I O Port Configuration External BNC Configuration Self Tests 1 Move the cursor to Self Tests with the front panel knob and press SELECT i U The self tests are loaded from the Performance Verification disk The process of Caution running the self tests destroys the current configuration and data 2 Insert the Performance Verification disk or copy of it into the disk drive Self Tests HP 1652B 1653B 6B 2 Service Manual 3 Move the cursor to the Start self test field with the front panel knob and press SELECT After loading the self tests the HP 1652B 1653B Self Tests menu will display the following Untested Analyzer Data Acquisition Untested Scope Data Acquisition Untested RS 232 C Untested BNC Untested Keyboard Untested RAM Untested ROM Untested Disk Drive Cycle through tests 4 To select a self test move the cursor to the appropriate test with the front panel knob and press SELECT To leave the HP 1652B 1653B Self Tests menu move the cursor to Done and press SELECT The HP 1652B 1653B will reload the operating system from the disk and display the default System Configuration menu ui The operating system disk or copy of it must be in disk drive to reload
148. rrange for repair or replacement at HP option without waiting for claim settlement Operating Disk The instrument is shipped with a yellow protective disk in the disk drive Before Installation applying power to the instrument remove the protective disk from the disk drive and install the operating system disk Reinstall the protective disk whenever the instrument is to be transported Power The HP 1652B 1653B Logic Analyzer requires a power source of either 115 Vac or Require ments 230 Vac 22 to 1076 single phase 48 to 66 Hz 200 Watts maximum power Caution W BEFORE CONNECTING POWER TO THIS INSTRUMENT be sure the Line Voltage Select switch on the rear panel of the instrument is set properly and the correct fuse is installed HP 1652B 1653B Installation Service Manual 2 1 E SSS Line Voltage When shipped from the factory the line voltage selector is set and an appropriate Selection fuse is installed for operating the instrument in the country of destination To operate the instrument from a power source other than the one set at the factory 1 Turn the rear power switch to the OFF position and remove the power cord from the instrument 2 Remove the fuse module by carefully prying at the top center of the module until you can grasp it and pull it out by hand see figure 2 1 LINE FILTER SWITCH ASSEMBLY 165 E02 Figure 2 1 Removing the Fuse Module Installation HP 1652B 1653B 2 2 Service Man
149. see figure 3 1 and 3 2 BNC m m Coupler 2 HP 1250 0216 BNG Cablet 2 xu ere Ge eee es HP 10503A BNC Tee m f f 2 oo oooo o HP 1250 0781 Procedure 1 Connect the HP 1652B 1653B and test equipment as in figure 3 3 OSCILLOSCOPE PULSE GENERATOR LOGIC ANALYZER OMDODD Ter P d 3 1 BS Figure 3 3 Setup for Data Test 1 01650849 De In this setup only eight channels are tested at one time to minimize loading The Note ground lead must be connected to ensure accurate test results Performance Tests HP 1652B 1653B 3 6 Service Manual 2 Adjust the pulse generator for the output in figure 3 4 l CONS mere ny DATA OUTPUT A 10NS CLOCK OUTPUT B QV 01650W10 Figure 3 4 Waveform for Data Test 1 Setting for HP 8161A Parameter Output A Output B Input Mode Norm Period PER 60 ns Width WID 10 ns 10 ns Leading Edge LEE 1 ns 1ns Trailing Edge TRE 1 ns 1 ns High Level HIL 3 2 V 3 2 V Low Level LOL OV OV Delay DEL Ons Ons Output Mode ENABLE ENABLE 3 Assign the pod under test to Analyzer 1 in the System Configuration menu as in figure 3 5 Refer to steps a through c if you are unfamiliar with menus System Configuration Analyzer Analyzer 2 Oscilloscope Neme MACHINE 1 Type Type unassagneg Analyzer oas Figure 3 5 System Configuration for Data Test 1 a Move the cursor to the Type field of Analyzer
150. shooting Service Manual 6C 5 CHART 5 PERF ORM KEYBOARD SELF TEST YES CHECK SIGNAL INPUT TO KEYBOARD TABLE 6C 3 KEYBOARD CABLE CONTINUITY OK REPLACE SYSTEM BOARD ASSEMBLY ENTIRE ROW NOT WORKING RPG REPLACE WORK ING KEYBOARD ASSEMBLY RPG VOLTAGES OK REPLACE RPG ASSEMBLY END 01652B14 Figure 6C 5 Trouble Isolation for Keyboard Troubleshooting HP 1652B 1653B 6C 6 Service Manual CHART 6 PERF ORM DISK DRIVE SELF TEST YES REMOVE DISC DRIVE CABLE FROM DISK DRIVE CHECK FOR VOLTAGES AND SIGNALS SIGNALS DISK DRIVE REPLACE AND VOLTAGES CABLE SYSTEM BOARD OK adir M ASSEMBLY REPLACE DISK DRIVE CABLE REPLACE DISK DRIVE ASSEMBLY END 01650F06 Figure 6C 6 Trouble Isolation for Disk Drive HP 1652B 1653B Troubleshooting Service Manual 6C 7 ED CHART 1 PERFORM CHART 7 DATA ACQUISITION SELF TEST REPLACE SYSTEM BOARD ASSEMBLY A1 NO POSSIBLE CABLE PROBLEM CONNECT A TARGET SIGNAL SOURCE FOR PROBE TESTING OR PERFORM DATA INPUT TEST 2 NOTE VERIFY THAT THERE ARE NO BENT OR BROKEN PINS ON THE SYSTEM BOARD CABLE CONNECTOR HP PART NUMBER 1251 8158 DO ANY PODS FAIL TO ACQUIRE DATA NO TROUBLE FOUND EXCHANGE SUSPECT PROBE TIP ASSEMBLIES WITH KNOWN GOOD ASSEMBLIES REDO TEST 2 REPLACE
151. sions amplitude 9 Press TRACE TRIG and adjust the trigger Level for a stable display The signal on screen should be five cycles at approximately 2 divisions amplitude 10 Press DISPLAY and set Display to AVG 16 Performance Tests HP 1652B 1653B 3 46 Service Manual 11 After the measurement settles averaging complete about 10 seconds use Auto Measure to obtain a peak to peak voltage measurement as in figure 3 57 Scope Waveforms Markers _ Time Display AVGe 16 Connect dots On X to 0 Trig to X Trig to 0 3 100 us s Div 000 us Deley Grid Figure 3 57 Waveforms Display Menu 12 Set the power meter Cal Factor to the 100 kHz value from the cal chart on the power sensor probe then press dB REF to set a 0 dB reference 13 In the Waveforms Display menu set Display to Normal and s Div to 5 ns 14 Change the signal generator to 100 MHz and set the power meter Cal Factor to the 100 MHz value from chart 15 Adjust the signal generator amplitude for a power reading as close as possible to 0 0 dB REL 16 Set the oscilloscope Display to AVG 16 17 After the measurement settles averaging complete use Auto Measure to obtain a peak to peak voltage as in step 11 Note this value 18 Calculate the response using the formula V100MHz Response dB 20 log10 a Z 19 Correct the result from step 18 with any difference in the power meter from step 15 Observe signs For example Result
152. t as in the previous figure 3 39 17 Adjust the power supply output for 10 2 V 18 Press RUN Data displayed on Timing Waveforms display is all low for the pod and channels under test as in the previous figure 3 40 19 Remove the probe tip assembly from the logic analyzer probe cable and attach it to the next logic analyzer probe cable to be tested Take care not to dislodge grabbers from the test connector 20 Repeat steps 2 through 18 until all pods have been tested pods 1 through 5 21 Disconnect the lower eight bits bits 0 through 7 from test connector and attach the upper eight bits bits 8 through 15 to the test connector 22 Repeat steps 2 through 19 until the upper bits of all pods have been tested pods 1 through 5 Performance Tests HP 1652B 1653B 3 34 Service Manual Oscilloscope Performance Tests Input Resistance Test B Note M HP 1652B 1653B Service Manual These procedures test the HP 1652B 1653B oscilloscope module s electrical performance using the specifications listed in section 1 as the performance standards All tests can be performed without access to the interior of the instrument Results of performance tests may be tabulated in the Performance Test Record at the end of this section Description This test checks the input resistance of the vertical inputs A four wire measurement is used for accuracy at 50 2 Input resistance is not a specification but this test is
153. t impedance is at 50 Q DC Offset Resolution 1 1 Probe Vertical Sensitivity Resolution lt 50 mV div 200 uV 100 mV div 200 mV div 1 mV 500 mV div 1 V div 5mV gt 2 V div 25 mV or 4 digits of resolution whichever is greater Probe Factors Any integer ratio from 1 1 to 1000 1 Channel Isolation 40 dB dc to 50 MHz 30 dB 50 MHz to 100 MHz with channels at equal sensitivity Horizontal Timebase Range 5 ns div to 5 s div Timebase Resolution Time Division Setting Resolution t 10 ns div 100 ps t2 10 ns div adjustable with 3 digit resolution Delay Pre trigger Range Time Division Setting Delay 5 ns x s div x 500 ns 5 X sec div 500 ns s div lt 5s 2 5 us General Information HP 1652B 1653B 1 16 Service Manual Trigger Waveform Display HP 1652B 1653B Service Manual Delay Post trigger Range Time Division Setting Available Delay 25 ms 5 s div 40 X s div 100 us 25 ms div 1s 5 ns 100 us div 10 000 X s div Triggering on either input channel rising or falling edge Trigger Level Range dc Offset 5 divisions Trigger Level Resolution 1 1 Probe Trigger Level Resolution x 50 mV div 400 uV 100 mV div 200 mV div 2mV 500 mV div 1 V div 10mV 22 V div 50 mV Arming Armed by the Run key external BNC low input or by Analyzer 1 or 2 Trigger Modes Immediate Triggers immediately after the arming condition is met Edge Triggers on the rising or falling edge from channel
154. t the left side of the display and press SELECT b Move the cursor to Insert waveform and press SELECT c Move the cursor to CH 2 and press SELECT Turn off channel 1 by deleting the channel 1 waveform Set Input to CH 2 and connect the power supply to Channel 2 Repeat steps 7 through 11 for channel 2 m Offset errors can be caused by the need for self calibration Perform the Offset Note ul Calibration see Adjustments before troubleshooting the instrument If self calibration fails to correct the problem the cause may be the attenuator or oscilloscope assembly Performance Tests 3 44 HP 1652B 1653B Service Manual Bandwidth Test Description This test checks the bandwidth of the oscilloscope in the HP 1652B 1653B ui Before doing the Bandwidth test verify that the Attenuator Calibration is valid Note oP performed within the last six months or 1000 hours Specification Bandwidth dc to 100 MHz Equipment Required Signal Generator ooooo oomoo HP 8656B Power Meter 00 0 cee ee eee eens HP 436A Power Sensor 0 00 c cece cece eens HP 8482A Power Spiel eie mob pr LIE iia HP 11667B Type N m 24 inchcable HP 11500B Type N m to BNC m Adapter HP 1250 0082 Procedure 1 With the N cable connect the signal generator to the power splitter input Connect the power sensor to one output of the power splitter as in figure 3 54 SIGNAL GENE
155. te tagging and prestore e Small lightweight probing Some of the main features of the digitizing oscilloscope include the following e 2channels of 400 Msamples s digitizing for 100 MHz bandwidth single shot analysis e 2k memory depth e Automatic pulse parameters which display time between markers acquires until capturing specified time between markers and performs statistical analysis on time between markers e Arming by either analyzer or BNC input e 60 mV through 40 V full screen resolution e Lightweight miniprobes HP 1652B 1653B General Information Service Manual 1 3 Other main features of the HP 1652B 1653B include the following e A user interface consisting of a panel keyboard with a Rotary Pulse Generator RPG knob e Nine inch white phosphor high resolution monitor e 3 5 inch floppy disk drive e HP IB and RS 232C interfaces for hardcopy output to a printer or controller interface Accessories The following accessories are supplied with the HP 1652B 1653B Logic Analyzer Supplied e Woven probe cable HP part number 01650 61607 with a 40 pin connector on each side 17 signal lines 18 return lines 2 chassis ground lines and 2 power lines Each power line supplies 5 volts for preprocessor power Each cable supplies 600 milliamperes with a maximum power available from the HP 1652B 1653B of 2 amperes Five probe cables are supplied with the HP 1652B and two are supplied with the HP 1653B e Probe T
156. the Note wj operating system after leaving the Self Tests menu Analyzer Data The Analyzer Data Acquisition self test verifies the functionality of key elements of Acquisition the internal acquisition system Self Test 1 In HP 1652B 1653B Self Tests menu move the cursor to Analyzer Data Acquisition and press SELECT A menu will appear with a description of the test the number of runs and failures for the selected test and fields to select Single test Repetitive test or Done 2 Move the cursor to Single test or Repetitive test and press SELECT The message Running Data Acquisition Test appears on screen while the instrument is performing the test When the test 1s finished the message Data Acquisition Test complete will appear on screen 3 If you are running repetitive tests press the front panel STOP key when you want to discontinue the test The number of runs and failures will be displayed in the menu 4 To return to HP 1652B 1653B Self Tests menu move the cursor to Done and press SELECT HP 1652B 1653B Self Tests Service Manual eB 3 Scope Data The Scope Data Acquisition self test verifies the functionality of key elements of Acquisition the internal acquisition system These key elements include the following Self Test Stope Memory Scope Pretrigger Delay Scope Trigger Scope Sample Rate Scope Preamp Scope Interpolator In HP 1652B 1653B Self Tests menu move the cursor to Scope Data Acquisition and p
157. thin the range of 5 180 V to 5 220 V If the voltmeter reading is out of this range adjust the 5 20V ADJ on the Power Supply Assembly to 5 200 V 20 020 V 5 180 V to 5 220 V dl High voltages exist on the sweep board that can cause personal injury Avoid Caution contact with the CRT monitor sweep board when adjusting the 5 20V HP 1652B 1653B Adjustments and Calibration Service Manual 4 3 CRT Monitor The CRT Monitor Assembly Adjustments optimize the characters of the CRT Assembly display Set up the instrument for these adjustments as follows Ad justme nts 1 Turn off the HP 1652B 1653B and disconnect the power cord Then remove the top cover Caution W The adjustment procedures are performed with the top cover of the instrument removed Take care to avoid shorting or damaging internal parts of the instrument 2 Connect the power cord to the HP 1652B 1653B and turn on the instrument 3 In the System Configuration menu select the Type field for Analyzer 1 MACHINE 1 and when the pop up appears select Timing Intensity 1 Press the DISPLAY key to place the Timing Waveforms menu on the screen Sub Bright and of the HP 1652B 1653B Contrast Adjustment n This menu is used because it has characters throughout the screen which are Note ad watched during the procedures Any other menu may be used however the adjustments may not be as accurate if characters and or lines are not displayed throughout the screen
158. tion 1 February 1990 01652 90905 List of Effective Pages NENA es dS a cr A KM AE The List of Effective Pages gives the date of the current edition and of any pages changed in updates to that edition Within the manual any page changed since the last edition is indicated by printing the date the changes were made on the bottom of the page If an update is incorporated when a new edition of the manual is printed the change dates are removed from the bottom of the pages and the new edition date is listed in Printing History and on the title page Pages Effective Date al x 25b SL do aS e rs February 1990 Contents Section 1 General Information O 1 1 Instruments Covered by this Manual o oooooooooccorocmmmoo o 1 2 Safety Considerations eue eoe diario 1 2 Product De sctIDBOB sde 1 3 Accessories Supplied Lose CER pend uds ER a Reti Dana 1 4 Accessories Available fio ei ete R ROLE CPPID Da qu eg pad 1 5 Logic Analyzer Specifications Voice weaned UE Adde 1 7 PrODES isidro 1 7 State Mode 4 1i bebo b OS AAA 1 7 Timing Mode seeriate eners AA een AA 1 7 Logic Analyzer Operating Characteristics 0 eee eee eee cree erence 1 7 Probes ener ESO RSS 1 7 Measurement Configurations eese nent 1 8 State Aa SiS aero ps A A 1 8 Timing Analysis corras da aos Mo e TTE 1 11 Measurement and Display Functions 2 ee eee eee ees 1 12 Oscilloscope Specifications
159. tion as in figure 3 34 Follow steps a through d if you are unfamiliar with menus MACHINE Timing Trace Specification Trece mode Singie Armed by Acquisition mode Glitch Lebel gt Bese gt Find n Pattern XX present for Then find Figure 3 34 Glitch Test Timing Trace Specification a Move the cursor to the Acquisition mode field and select the Glitch mode b Move the cursor to the Find Pattern field and press SELECT Assign all Don t Cares all Xs and press SELECT c Set the Present for field to gt 30 ns d Set Then find Glitch on for all channels on off HP 1652B 1653B Performance Tests Service Manual 3 29 6 Press RUN The timing analyzer acquires data and shows glitches for channels under test as in figure 3 35 Select the Delay field and rotate the knob to assure consistent glitch detection MACHINE Timing Waveforms Markers Accumulate Off Time Div Deley Sample period Figure 3 35 Glitch Test Timing Waveforms ucl If the sample clock and data synchronize glitches may be displayed on the timing a screen as valid data transitions Note 7 Remove the probe tip assembly from the logic analyzer probe cable and attach it to the next logic analyzer probe cable to be tested Take care not to dislodge grabbers from the test connector 8 Repeat steps 3 4 and 6 until all pods have been tested pods 1 through 5 Make sure to assign the correct po
160. tion for BNC Troubleshooting HP 1652B 1653B 6C 10 Service Manual CHECK SYSTEM CONF IGURAT ION MENU DOES OSCILLOSCOPE APPEAR NO YES TURN OFF BOTH LOGIC ANALYZER MACHINES ATTEMPT TO OBTAIN AN OSCILLOSCOPE ACQUISITION CHECK OPERATING SYSTEM DISK IS CORRECT OPERATING SYSTEM USED NO YES OBTAIN CURRENT VERSION OF SYSTEM ROMS DOES TIMEBASE BS SWEEP YES IS DATA NO CORRECT YES NO TROUBLE FOUND END 01632811 HP 1652B 1653B Service Manual CHECK PROBES ARE PROBES GOOD NO YES PERFORM OSCILLOSCOPE PV AND CAL PROCEDURES dev YES CHART 11 OBTAIN CURRENT VERSION OF 1652B 53B OPERATIONAL SYSTEM SOFTWARE END CHECK RESET OSCILLOSCOPE BOARD CABLE W13 REPLACE PROBES END REPLACE OSCILLOSCOPE BOARD END Figure 6C 11 Trouble Isolation for Oscilloscope REPLACE OSCILLOSCOPE BOARD Troubleshooting 6C 11 Power Su pply The power supply must be loaded by either the System Assembly Board or with an Voltag es Check added resistor to check the voltages Warning A This procedure is to be performed only by service trained personnel aware of the hazards involved such as fire and electrical shock Power Supply Loaded by System Assembly 1 Remove the instrument top cover 2 Using the figure below check for the voltages indicated at the testpoints T id
161. tion of major assemblies of the HP 1652B 1653B Logic Analyzer Read the Safety Summary at the front of this manual before servicing the instrument The relative location of the replaceable components are shown in figure 6D 1 The part numbers and descriptions for these components are listed in section 5 Hazardous voltages exist on the power supply the CRT and the display sweep board To avoid electrical shock adhere closely to the following procedures After disconnecting the power cable wait at least three minutes for the capacitors on the power supply and sweep boards to discharge before servicing this instrument Never attempt to remove or install any assembly with the instrument ON or the power cable connected This can result in component damage The effects of ELECTROSTATIC DISCHARGE can damage electronic components Use grounded wriststraps and mats when performing any kind of service to this instrument Assembly Removal and Replacement 6D 1 DETAIL A HIO A190 BELOW AS MP4 MP3 H5 H13 H4 W8 SMALLER CABLE BELOW W2 MP 12 w2 MP 1 01653E09 MP7 MP8 MP2 1 Figure 6D 1 HP 1652B 1653B Exploded View HP 1652B 1653B Service Manual Assembly Removal and Replacement 6D 2 Removal and 1 Turn off the instrument and disconnect the power cable Rep lacement of 2 Disconnect the logic analyzer cables from the rear panel of the instrument the Rear Panel l 3 Remove the six screws from the top and
162. tormance Test Interval 34 5 oor RE RERO UL EARS 3 3 Performance Test Procedures ii AAA ERE pe xe EE See ee 3 3 Logic Analyzer Performance Tests 0 cc cece cece cece eee n ene eeees 3 5 RESUCODUCCION Artic ee exeant 3 5 Clock Qualifier and Data Inputs Test 1 oooooooommoomoo 3 6 Clock Qualifier and Data Inputs Test2 LLssuu 3 11 Clock Qualifier and Data Inputs Test 3 HP 1652B Only 3 15 Clock Qualifier and Data Inputs Test 4 ooooooooooooooo o 3 18 Clock Qualifier and Data Inputs Test 5 ooooooooomo 3 21 Clock Qualifier and Data Inputs Test 6 ooooooooomommoo 3 24 Ghlitch TEST ai rupe Vo de aed oa Ob bd av e ador et Nue ds 3 27 Threshold Accuracy Test 222444545 6360240 bsceddsaesnia tin ciabacdw as 3 31 Oscilloscope Performance Tests caritas AEn diei bass 3 35 input Resistance Test soii sd coi 3 35 Voltage Measurement Accuracy Test ooooooocooooooommmo m 3 37 DC Offset Accuracy Tetu ad da 3 42 Bandwidth Test east ads tenuit 3 45 Time Measurement Accuracy Test oooooooooomcoocrormo rom 3 48 Trigser seusitivity Lest anise ve sinu eb veces ede PS os 3 51 Performance Tests Pu MCCC EE cM EMEN a o UM Introduction The procedures in this section test the instrument s electrical performance by using the specifications listed in section 1 as the performance standards All tests may be performed without ac
163. two BNCS for input or output of an external trigger and a BNC for oscilloscope probe compensation The instrument is built around the 68000 microprocessor and powerful data acquisition ICs that probe shape store and analyze data from a target system An acquisition interface to the 68000 makes the data acquisition system fully compatible with the architecture of the 68000 microprocessor The System Assembly Board contains the necessary circuitry to interface the keypad CRT monitor disk drive RS 232 C and HP IB ports Figures 6A 1 and 6A 2 show a simplified block diagram of the instrument Theory of Operation 6A 1 CRT MONITOR ASSEMBLY SYSTEM CRT fi CONTROLLER J12 ANO POD1 JS RAM DATA ACQUISITION TEAM l t POD2 J4 1 contro Y bre Unive ADDRESS BUS HP 16528 ONLY ACQUIRED DATA lt dt gt DATA BUS AND A2 AND MP13 INTERFACE J15 KEYPAD AND KNOB ASSEMBLY eo l BOO d INTERFACE REAR DANE Sus l 7 i Eon d INTERFACE CREAR PANEL US 5V 3 5V 12V 5 2V 12V COM ep OE ap w4 EXTERNAL EXTERNAL POWER SUPPLY ASSEMBLY TRIGGER TRIGGER IN OUT Figure 6A 1 System Board Assembly Block Diagram Theory of Operation HP 1652B 1653B 6A 2 Service Manual CH1 IN CHANNEL 1 SAME AS CHANNEL 2 CH2 ATTENUATOR AND IN PRE AMP FISO MEMORY OFFSET LOW FREQ AMP SAMPLE CLOCK
164. ual 3 Reinsert the fuse module with the arrow for the appropriate line voltage aligned with the bar on the line filter assembly switch see figure 2 2 O1650E03 3 0 A FUSE 300 A FUSE Figure 2 2 Fuse Module Settings 4 Reconnect the power cord turn the rear power switch to the ON position and continue normal operation ae Power Cable This instrument is equipped with a three wire power cable When connected to an appropriate AC power outlet this cable grounds the instrument cabinet The type of power cable plug shipped with the instrument depends on the country of destination See Table 2 1 for the option numbers of available power cables and plug configurations nn To o o Applying Power When power is applied to the HP 1652B 1653B a power up self test is automatically performed For information on the power up self test refer to section 3 HP 1652B 1653B Installation Service Manual 2 3 Table 2 1 Power Plug Cord Configurations PLUG TYPE CABLE PLUG DESCRIPTION LENGTH COLOR COUNTRY PART NO IN CM OPT 900 8120 1351 Straight BS1363A 90 228 Gray United Kingdom 8120 1703 90 90 228 Mint Gray Cyprus 79 200 Gray Australig 87 221 Mint Gray New Zealand Nigeria Zimbabwe Singapore 8120 1369 8120 0696 Straight NZSS198 ASC 90 8120 1689 Straight CEE7 Y 11 79 200 Mint Gray East and West Europe 8120 1692 90 79 200 Mint Gray
165. ugh 5 have been tested with all clocks Performance Tests HP 1652B 1653B 3 20 Service Manual Clock Qualifier Description and Data Inputs Test 5 This performance test verifies the maximum clock rate for mixed mode clocking during a state operation Specification Clock repetition rate Single phase is 35 MHz maximum 25 MHz maximum for the HP 1653B With time or state counting minimum time between states 1s 60 ns 16 7 MHz maximum Both mixed and demultiplexed clocking use master slave clock timing The master clock must follow the slave clock by at least 10 ns and precede the next slave clock by 50 ns Equipment Required Pulse Generator ooooooooo o HP 8161A 020 OSCIIIOSCODOG soraia ete oes HP 54502A 50 Ohm Feedthrough 2 HP 10100C Test Connector 2 ovd bcm teh ie see figure 3 1 and 3 2 BNC m m Coupler 2 HP 1250 0216 BNC Cable 2 incre HP 10503A BNC Tee m f f 2 o HP 1250 0781 Procedure 1 Connect the HP 1652B 1653B and test equipment as in figure 3 22 by connecting channels 0 3 and 8 11 of the pod under test to the test connector On the slave clock transition the four bits of the lower byte are transferred to the logic analyzer On the master clock transition the four bits of the upper byte are transferred to the logic analyzer OSCILLOSCOPE PULSE GENERATOR LOGIC ANALYZER 5eQ Sell reure 3 1 mao O07 0165084

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