Home

HP 4277a User's Manual

1. MED SLOW FAST B a S 2 t id Q I 9 d DR LL B o m od e o m A A i 1 E Z x H 5 10k 100k IM 10k 100k iM Test Frequency Hz Test Frequency Hz Figure K MED SLOW FAST e be o o 42 2 o s A H H o o e m i i E G ti 8 L 4 3 E 63 3 3 SC 0 1 ui mm T ams EE 100k IM Test Frequency Hz Test Frequency Hz Figure L Note Numbers not enclosed in parentheses apply when Test Signal Level is HIGH numbers enclosed in parentheses apply when Test Signal Level is LOW Figure 3 4 Measurement Ranges and Number of Display Digits Sheet 15 of 16 3 31 SECTION III Model 4277A SLOW FAST Full Scale Factor Fuil Scaie Factor 100k Test Frequency Hz Test Frequency Hz Note Frequency range is 18 1kHz to 19 9kHz Figure M SLOW FAST Full Scale Factor full Scale Factor 100 Frequency Hz Test Frequency Hz Figure N Note In Figures M and N numbers not enclosed in parentheses apply when Test Signal Level is HIGH numbers enclosed in parentheses apply when Test Signal Level is LOW
2. SECTION HI LIMIT LOW HIGH DEEST 2 Press the ERASE button 2 to erase previously stored limits One 1 will be 9 displayed on the FREQUENCY DC BIAS display Limit Entry 3 Press the L C 1Z key 3 4 Press the LIMIT LOW key 4 5 Key in the desired LOW limit using the 11 12 HANDL R INTERFACE Y Y Key in the desired HIGH limit using the DATA keys 5 The HIGH limit value will be displayed on DISPLAY B Press the ENTER key The HIGH limit will be stored for bin 1 Press the BIN NO UP key Two 2 will be displayed on the FREQUENCY DC BIAS display l Repeat steps 4 through 9 to enter the LOW and HIGH limits for bin 2 Repeat steps 10 and 11 for bins 3 through 9 DATA keys 6 The LOW limit value will be displayed on DISPLAY A Press the ENTER key The LOW limit will be stored for bin 1 Also the maximum allowable value that ean be entered for the HIGH limit on the present LCIZ RANGE will be displayed on DISPLAY B D Q ESR G Limit Entry 13 Press the D Q ESR G key Note When D Q ESR G limits are being entered no bin number is displayed on the FREQUENCY DC BIAS display Note If the LOW or HIGH limit is higher than the full scale value of the existing LC Z RANGE E18 will be briefly displayed on DISPLAY A when the ENTER key is pressed Re enter the limits correctly 7 Press the LIMIT HIGH key 7
3. 103284 STEDS TINA Jo13e4 eieog rInj Frequency Hz Test Test Frequency Hz SLOW FAST X044 STEOS TTNA 1015834 epeos T Tas Test Frequency iz Test Frequency Hz ae e L os MO CE E YA RE LES Eu E cU zc o FE a 6 LE a gt u SE Pd S X Q a EZ e Ud S C Es 5 gt R O a Z aK W W 9 S 20 E s 33 ae HIGH Note Figure 3 4 Measurement Ranges and Number of Display Digits Sheet 3 of 16 3 19 SECTION HI Full Scale Factor 3 20 Model 4277A NUMBER OF DISPLAY DIGITS FOR DISSIPATION FACTOR Note 2 3 IN C D MEASUREMENT F inF See Figure D i Numbers not enclosed in parentheses apply when Test Signal Level is HIGH numbers enclosed in parentheses apply when Test Signal Level is LOW Shaded areas indicate that measurement cannot be performed When the measured C value is less than 5 of full seale D measurement cannot be performed MED SLOW FAST Full Scale Factor Test Frequency Hz Test Frequency Hz Add one digit at 10k 100k and IMHz when Test Signal Level is LOW Frequeney range is 18 1kHz to 19 9kHz Numbers not enelosed in
4. Figure 3 4 Measurement Ranges and Number of Display Digits Sheet 16 of 16 3 32 Model 4277A SECTION MI C D Measurement C ESR G Measurement Range 10 0k to 1 00M 1M2 10uS 100k0 100uS 10K 10kQ ImS 1kQ 1kQ 10mS 1000 100mS 100 18 L D Measurement L ESR G Measurement ESR G Test Frequency Hz Range OOK T Test Frequency Hz 10 0k 10 0k to 1 00M 1kQ 10mS 1000 100mS 100 15 Z 6 Measurement 10 0k to 1 00M 1kQ Figure 3 5 Measurement Ranges and Range Resistors 3 33 SECTION Ill Note When a C D measurement is made with the instrument eontrols set as follows the number of display counts depends on frequeney as shown in Figure 3 6 CIRCUIT MODE AUTO sth LCIZ RANGE MANUAL Test Frequency sesse 15 9kHz 20 0kHz or 159kHz 200kHz As an example suppose you re measuring a 180pF eapacitor on the 100pF range at 17kHz and the measured value is 175 62pF If the test frequency is increased to 19kHz OF will be displayed on DISPLAY A because the maximum number of counts at this higher frequency is only 17000 as shown in Figure 3 6 C Counts 19999 19000 D Value 1 9999 1 8000 1 6000 77 4000 Z777 1 2000 i i 9K I7K I8K ISK 20K I59K I7OK BOK I90K 200K Test Frequency Hz Figure 3 6 Number of Counts vs Frequency 3 34 Model 4277A 3 32 CIRCUIT MODE 3 33 An impedance ean be r
5. 20 Data Terminator 3 64 Model 4277A Note DC Bias data is not output when DC Bias option Option 001 is not installed Similarly when the comparator Option 002 is not installed comparator data is not output Note Don t open the UNKNOWN terminals no test fixture or test leads when LEARN mode data is output in AUTO range If so measurement range is not fixed in some cases There is no problem when a test fixture is connected to the UNKNOWN terminals or when measurement range is set to MANUAL mode 3 102 RECALL COMPARATOR LIMIT DATA 3 103 Low and high bin limits can be output from the 4277A when the program code LR is used refer to Figure 3 30 The L C Z limits for the designated bin are output when program code LI is used When program eode L2 is used D Q ESR G limits are output The data is output in the following format LLXX XXXEN LHXX XXXEN Q 1 2 3 I Value of Low Limit position of decimal point is coincident with display 2 Value of High Limit position of decimal point is eoineident with display 3 Data Terminator 3 104 SERVICE REQUEST STATUS BYTE 3 105 The 4277A outputs an RQS Request Service signal whenever it is set to one of the five possible service request states Figure 3 26 shows the eontents of the Status Byte Model 4277A SECTION IMI Gam ela e Js Content RQS Error Trigger Zero Offset Syntax Data Error Ready Too Self Test Fast End
6. Adjust the power supply in accordance with the procedure given in Figure 2 5 Figure 2 4 Option Installation Model 4277A SECTION II kart 4 Connect the 4277A to the ae power line ed Turn on the instrument 16064 should be displayed on DISPLAY B Pa Connect a DVM HP 34784A is recommended to ALTP1 and GND as shown below 4 Adjust V ADJ on the A4 board until the reading on the DVM is 5 10V 0 02V fi i Rear V ADJ 9 AA board Front Figure 2 5 Power Supply Adjustment After Installing Option 002 SECTION I Model 4277A V iti dci i ee a Pull up Resistor PWF RESET GG Z T i t b S 500ms A104 ON OFF a b Access Hole Cap HP Part No 6960 000I Rear Pane A6 Board Top View d c Figure 2 6 Power Failure Monitor Installation Model 4277A SECTION III SECTION Ill OPERATION 3 1 INTRODUCTION 3 2 This seetion provides all the information necessary to operate the Model 4277A LCZ Meter Ineluded are deseriptions of the front and rear panels displays lamps and eonneetors discussions on operating procedures and measuring techniques for various applications and instructions on the instrument s SELF TEST funetion Warnings Cautions and Notes are given throughout they should be observed to insure the safety of the operator and the serviceability of the instrument WARNING BEFORE THE INSTRUMENT IS SWITCHED ON
7. Model 4277A SECTION HI Table 3 6 Operation Error Codes Displayed on DISPLAY A B Sheet 1 of 3 Overflow The inductance capacitance or impedance of the DUT is too high to be measured on the selected LC Z RANGE Select a higher LC z RANGE DISPLAY A CEDE DISPLAY grea d uH mM oco Overflow The dissipation factor quality factor ESR or conductance of the DUT is too high Change the DISPLAY B function or change the DISPLAY A function to Z DIGPLAY A TT RER 1 BRAY x GEE gH abp H z z coo Mer camer Select a lower LC Z RANGE Underflow The inductance capacitance or impedance of the DUT is too low to be measured on the selected LC Z RANGE Underflow The dissipation factor quality factor ESR or conductance of the DUT is too low Change the DISPLAY B function or change the DISPLAY A function to Z Change Function The selected parameter cannot be measured with the present control settings Change the DISPLAY A function to another parameter Change the DISPLAY B function or change the DISPLAY A function to z Use a different test fixture or test leads or if nothing is connected to the UNKNOWN terminals connect an appro priate test fixture or test leads Refer to paragraph 3 50 for details on Zer
8. L en Set DC BIAS select switch on rear panel to EXT Connect the test fixture or test leads to the UNKNOWN terminals of the 4277A Turn on the instruments Set the 4277A s eontrols as described in Steps 5 through 7 of Figure 3 20 Set the DISPLAY A funetion to C measurement mode Perform OPEN and SHORT Zero Offset Adjustments as deseribed in paragraph 3 51 Connect a sample to the test fixture or test leads Model 4277A DC POWER SUPPLY AC Bypdss Capacitor CAUTION DO NOT SHORT THE HIGH AND LOW TERMINALS CAUTION WHEN A POSITIVE BIAS VOLTAGE IS USED THE POSITIVE TERMINAL OF ELECTROLYTIC CAPACITORS MUST BE CONNECTED TO THE INSTRUMENT S HIGH TERMINAL WHEN USING A NEGATIVE BIAS VOLTAGE CONNECT THE CAPACITOR S NEGATIVE TERMINAL TO THE INSTRUMENT S HIGH TERMINAL Set the external de voltage source to the desired output voltage Read the measured values Wait until the applied de bias across the sample becomes stable i Reset the external voltage source to 0V Remove the sample from test fixture or test leads Note Use a stable de voltage source Note To make stable measurements connect an ae bypass capacitor approximately luF between positive terminal and negative terminal of the external de voltage source Figure 3 23 External DC Bias Sheet 1 of 4 Model 4277A EXTERNAL DC BIAS OPERATION lt 200V To use the HP 16065A Test Fixture make eap
9. capacitance Cp 7 equivalent parallel circuit capacitance Obviously if no series resistance R or parallel conductance G are present the equivalent series circuit capacitance Cs and equivalent parallel circuit capacitance Cp are identical Likewise if R and G are not present the equivalent series circuit inductance Ls and equivalent parallel circuit induetance Lp are identical However a sample value measured in a parallel measurement circuit ean be correlated with that of a series circuit by a simple conversion formula which considers the effect of dissipation factor See Table 3 9 Figure 3 7 graphically shows the relationships of parallel and series parameters for various dissipation factor values Applicable diagrams and equations are given in the chart For example a parallel capacitance Cp of 1000pF with a dissipation factor of 0 5 is equivalent to a series capacitance Cs of 1250pF with an identical dissipation factor As shown in Figure 3 7 inductance or capacitance values for parallel and series equivalents are nearly equal when the dissipation factor is less than 0 03 The dissipation factor of a component always has the same value at a given frequency for both parallel and series equivalents SECTION III In ordinary LCR measuring instruments the measurement cireuit is set automatically or manually to a predetermined equivalent circuit with respect to either the selected range or to the d
10. 1Z1 49 of the DUT s impedance Figure 3 1 Front Panel Features Sheet 5 of 6 Model 4277A 9DC BIAS SWITCH On instruments equipped with Option 001 DC BIAS this switch turns the internal DC bias source on and off When this switch is s t to ON and the DC BIAS Select Switch 2 in Figure 3 2 on the rear panel is set to INT the DC voltage selected by the FREQUENCY DC BIAS Step Control Keys is output from the Hen UNKNOWN terminal When set to OFF this switch turns off the internal DC bias source no DC voltage is output from the Han UNKNOWN terminal 3 and OFF will be briefly displayed on the FREQUENCY DC BIAS Display 8 each time a new DC bias voltage is set by the FREQUENCY DC BIAS Step Control Keys or via the HP IB Note This switeh eontrols the internal DC bias souree only It does not control external DC bias voltage applied to the EXT INPUT INT MONITOR connector in Figure 3 2 on the rear panel Also this switeh is not HP IB programmable C ZERO Offset These buttons perform ZERO offset eompensation OPEN and SHORT for the residuals of the test fixture test leads and measurement circuit ZERO offset is performed at the following spot frequencies 1MHz 900kHz 700kHz 505kHz 202kHz 100kHz 50 5kHz 20 2kHz and 10kHz OPEN If this button is pressed when the test fixture or test leads are terminated open measured values at this time are stored as residual admittance data SHORT
11. 30nS 5 3 l2anS 60nS 5 3 6anS 30nS 5 E See Note 1 See Note l See Note 1 See Note 1 1 18auS 60nS 5 1 900nS 30nS 5 1 180uS 60nS BL 1 90anS 30nS 5 c 100u8 gt gt 3 5 LUK See Note 1 See Note 1 See Note 1 See Note 1 ee 1 1 8008 6 HS 5 1 9auS 5US 5 1 l 8ouS 6uS 5 1 9auS 30S 5 e Note 1 See Note 1 See Note l g Note 1 1 l8auS 645 5 1 9opS 3US 5 1 18auS 6uS 5 9xuS ZUS 5 2 30omQ 60m 5 2 30amQ 30m8 5 2 30am 60mQ 5 2 30gmQ 30mQ 5 See Note 2 See Note 2 See Note 2 5 Som 18mQ 5 5 SomQ lm 5 5 Som 18mQ 5 5 Soma 9m 5 See Note 2 See Note 2 See Note 2 See Note 2 10kHz 20kHz 100kHz 200kHz 1MHz SECTION I Model 4277A Table 1 1 Specifications Sheet 7 of 17 Equations in Tables A 4 and A 5 represent ESR Accuracy G Accuracy Full seale factor measured C value full scale C value For example when the measured C value is 850pF on the 1000pF range ais 0 85 Table A 6 Additional Measurement Error for ESR and G at 1MHz 06 of reading Jaus 05 of reading 30anS 06 of reading 4 of reading 10anS Note l ESR aceuracy is 2 C aceuracy measured C x 100 of ESR reading G aceuracy measured G x 100 of ESR reading 1 count G accuracy is 2 C accuracy measured C
12. 9 Set the CABLE LENGTH switch to 1m 6 Diseonneet the standard capacitor and connect the 16048A Test Leads to the UNKNOWN terminals Connect Open termination as shown in Figure 4 5 a Use the BNC f f adapters to permit connection of the termination Press ZERO OPEN button to perform open offset adjustment 7 Diseonneet Open termination and connect Short termination as shown in Figure 4 5 b Press the ZERO SHORT button to perform short offset adjustment 8 Disconnect Short termination and connect a IpF standard capacitor as shown in Figure 4 5 e 9 Set the test frequency to 1MHz and set the TEST SIG LEVEL in accordance with Table 4 7 b Capacitance and dissipation faetor readings should be within the test limits given in the table Model 4277A SECTION IV PERFORMANCE TESTS 10 Change the standard capacitor to 10pF 100pF and 1000pF in that order and verify that the capacitance and dissipation factor readings are within the test limits given in Table 4 7 b Table 4 7 a Capacitance Accuracy Tests CABLE LENGTH 0 Standard Capacitance IpF TEST SIG LEVEL HIGH TEST SIG LEVEL LOW Frequency 202kHz C V 0 0052pF 040 009 C V 0 21pF 505kHz C V 0 0046pF 0 0 0040 C V 0 21pF 0 0 11 IMHz C V 0 0045pF 0 0 0040 G V 0 027pF 030 017 C V Calibrated Value of Standard Capacitor Test Table 4 7 a Capacitanee Aceuracy Tests CABLE LENGTH 0 continued Standard
13. CYtitcicro citi c 01 1010 1000101 O0 K oL cL oou oc C V Calibrated Value of Standard Capacitor Table 4 7 b Capacitanee Accuracy Tests CABLE LENGTH 1m test frequency 1MHz es POCO standard TEST SIG LEVEL HIGH TEST SIG LEVEL LOW Capacitor est Limits D Test Limits IpF V 40 0083pF 0 0 0050 V 0 055pE 0 0 015 10pF V 0 020pF 050 0019 V 0 030pF 040 0038 100pF V 0 18pF 0 0 0018 V 0 26pF 050 0036 1000pF V 0 0021nF 050 0019 V 0 0032nF 0 0 0038 C V Calibrated Value of Standard Capacitor Model 4277A SECTION IV em PERFORMANCE TESTS 4 19 RESISTANCE ACCURACY TEST 4 20 This test checks resistance measurement accuracy for various eombinations of test signal frequency and test signal level The resistance accuracy checks are made by connecting a standard resistor to the instrument and eomparing the measurement results with the ealibrated values of the standard EQUIPMENT Standard Resistors cesccsscccecsacses sassssasssssaes SUUM 1kQ 10kQ HP 16074A 100kQ Standard Resistor Terminations sonal E AT PMETE OPEN 058 Set Short PROCEDURE 1 Set the 4277 A s controls as follows DISPLAY A and B function cccsscsccccesscssecces Z1 8 CIRCUIT MODE RRR GELL AEP R Bi 64 EHH b HEHEHE Kbi R Lr K 48T AR AUTO LC Z RANGE 649999 7 46 4096 97 4499 9 94 60t9 55g609 9 6t t t AUTO MEAS SPEED ssssssasssessssss vac 98 AR RRR E EA CR scus
14. 10nP 1 BpF b Ho os 1 8 6pF 5 1 SpF 5 an 3 0005 a 0016 51 38 0005 a 0026 51 3 0005 4 0012 5133 0005 amp 0016 5 lnk i SpF 5 d 4 1 2pf 5 ab eps U 1 8pFE 5 1 1 2pF 3 3 6pF 5 NIE 000 a 0016 54 3 2005 9 T 0024 Sh 3 0005 a 00612 3 0005 a 0016 5 5 0005 a 0024 5 z 0005 a 0012 5 3 amp 80fF 10 os 12pF 5 1 GOFF 5 _ db SOfP 5 1 L2pF s lA 60 F 5 5 0005 m 003 3 0005 a 0024 5 3 000S a 0012 51 3 0005 8 0016 5 3 10005 0 0024 5 3 0005 00 0012 5 AS 12 F GfF 5 2 d s 1 3 0005 m 0024 54 00035 0012 5 34 BEF 10 e f rh pn 3 i 2fF i0 3 6fF 10 5 0005 a 003 5 5 0605 r 003 S lokHz 200kHz 500KHz IM Z Equations in Tables A 1 and A 2 represent Note l Tables A 1 and A 2 are applicable under the following conditions Sla 1 CABLE LENGTH 0m D Accuracy 2 Test Signal Level HIGH 1Vrms a Full seale factor measured C value 3 Sample s D Value 0 1 full scale C value For example when the measured C value is 850pF on 4 Zero offset adjustment has been performed the 1000pF range a is 0 85 with the OPEN and SHORT terminations of the Model 16074A Note 2 Error doubles when LOW test signa
15. 14 15 Press the LIMIT LOW key 4 Key in the desired LOW limit using the DATA keys 5 The LOW limit value will be displayed on DISPLAY A Figure 3 34 Option 002 Comparator Sheet 3 of 7 3 79 SECTION HI 16 Press the ENTER key 6 The LOW limit will be stored Also the maximum allowable value that can be entered for the HIGH limit will be displayed on DISPLAY B Note If the LOW or HIGH limit is higher than the full scale value of the existing DISPLAY B range E18 will be briefly displayed on DISPLAY A when the ENTER key is pressed Re enter the limits eorreetly HP IB OPERATION Model 4277A 17 Press the LIMIT HIGH key 7 18 Key in the desired HIGH limit using the DATA keys The HIGH limit value will be displayed on DISPLAY B 19 Press the ENTER Key Note Press the ERASE button 2 erases the high low limits of all bins To Controller 1 Conneet the Model 16064A COMPARATOR HANDLER INTERFACE to the COMPARATOR HANDLER INTERFACE connector on the 4277A s rear panel 2 Conneet the desired test fixture to the UNKNOWN terminals 3 Turn on the instrument 4 Perform OPEN and SHORT Zero Offset Adjustments 5 Set the front panel controls as appropriate for the desired measurement and enable the 16064A via the HP IB 3 80 Example of setting C D measurement InF range and 100kHz test frequency REMOTETI17 CLEAR 717 OUTPUT 717 A2BIFRI00ENRAT2 OUTPU
16. 9 99V range or 100mV 10V to 40V range setting resolution and can be keyed in directly from the front panel or remotely programmed via the HP IB Maximum disp ay resolution is 3 digits 1 25 OPTION 002 1 26 Option 002 equips the standard 4277A with the 16064A Comparator Handler Interface for go no go testing and automatie bin sorting Up to nine sets of HIGH LOW limits for one DISPLAY A function L C or Z and one set of HIGH LOW limits for one DISPLAY B funetion D Q ESR or G can be manually keyed in from the 16064A or entered from a remote controller via the HP IB Comparison results HIGH IN or LOWfor each measure ment parameter are indicated by LED lamps on the 16064A and by open colleetor TTL level voltages output from the handler interface connector HIGH Measured value exeeeds the HIGH limit IN Measured value is within the HIGH and LOW limits inclusive LOW Measured value is lower than the LOW limit 1 27 OTHER OPTIONS 1 28 The following options provide the mechanieal parts necessary for rack mounting and hand carrying Front Handle Kit Furnishes carrying handles for both ends of the front panel Option 907 Option 908 Rack Flange Kit Furnishes flanges for rack mounting Option 909 Raek Flange and Front Handle Kit Furnishes front handles Opt 907 and raek flanges Opt 908 Installation instructions for these options are given in Section II 1 29 Option 910 adds an
17. ALL PROTECTIVE EARTH TERMINALS EXTENSION CORDS AUTO TRANSFORMERS AND DEVICES CONNECTED TO IT SHOULD BE CONNECTED TO A PROTECTIVE EARTH GROUNDED SOCKET ANY INTERRUPTION OF THE PROTECTIVE EARTH GROUNDING WILL CAUSE A POTENTIAL SHOCK HAZARD THAT COULD RESULT IN SERIOUS PERSONAL INJURY ONLY FUSES WITH THE REQUIRED RATED CURRENT AND OF THE SPECIFIED TYPE SHOULD BE USED DO NOT USE REPAIRED FUSES OR SHORTED FUSEHOLDERS TO DO SO COULD CAUSE A SHOCK OR FIRE HAZARD CAUTION BEFORE THE INSTRUMENT IS SWITCHED ON IT MUST BE SET TO THE VOLTAGE OF THE POWER SOURCE MAINS OR DAMAGE TO THE INSTRUMENT MAY RESULT 3 3 PANEL FEATURES 3 4 Figures 3 1 and 3 2 identify and briefly deseribe the purpose of each key indicator and connector on the front panel and rear panel respectively More detailed information on front pane displays and eontrols is given starting in paragraph 3 5 3 5 SELF TEST 3 6 The self test function confirms correct operation of the instrument s basie funetions and facilitates troubleshooting It consists of three parts 1 ROM RAM Test 2 Display Test and 3 Analog Circuit Test Each is described in paragraphs 3 7 through 3 11 3 7 ROM RAM TEST 3 8 The ROM RAM Test is performed each time the instrument is turned on During this test all ROMs and RAMs in the instrument s digital control section are tested using a check sum test and a read write test RAMs only If a malfunction is detect
18. Bit 7 RQS indicates whether or not a service request exists Bits 6 and 8 are always zero 0 Bits 1 through 5 identify the type of service request Following are the service request states of the 4277A 1 Bitl This bit is set when measurement data is ready for output 2 Bit 2 This bit is set when the remote program contains a syntax error 3 Bit3 This bit is set when Zero Offset or Self Test is completed under remote control 4 Bit4 This bit is set when the 4277A is externally triggered before the measurement has been completed 5 Bit 5 This bit is set when the 4277A has one of the following operation errors OFF E10 E13 E14 E15 E16 E17 E18 E20 2 If Self Test is set to ON this bit is set when the instrument fails Self Test Error Codes E36 E43 O 0 A Z Da AJ Figure 3 26 Status Byte for the 4277A 3 106 PROGRAMMING GUIDE FOR 4277A or 3 107 Sample programs that can be run on the 2 9835A B Desktop Computer HP 85 9835A B 9845B 9826A or 9836A are 98332A I O ROM given in Figures 3 27 through 3 30 These programs are listed in Table 3 17 3 98034A HP IB INTERFACE CARD Note or Controller specifie HP IB programming information is given in the controller s 2 9845B Desktop Computer programming manual 98412A I O ROM Note 3 98034A HP IB INTERFACE CARD Foliowing equipment is required to run the sample programs or 1 4277A LCZ Meter 2 9826A Desktop Computer 2 HP 85
19. Option 001 Internal DC Bias Sheet 1 of 3 SECTION IH HP IB Operation The following procedure is an example of de bias remote control via the HP IB l Set the DC BIAS select switch Dto INT 2 Conneet the 16047A Test Fixture to the UNKNOWN terminals Note Any of the test fixtures and test leads listed in Table 1 3 ean be used for measurements requiring de bias Turn on the 4277 A Perform OPEN and SHORT Zero Offset adjustments as deseribed in paragraph 3 51 Set the DC BIAS ON OFF switch 2 to ON Note The de bias voltage is automatieally set to OV each time the instrument is turned on 6 Set the front panel eontrol via the HP IB Example of setting the instrument for a C D measurement at 10kHz external trigger REMOTE 717 CLEAR 717 OUTPUT 717 A2BIFRIO0ENFIT2 Model 4277A ll W Connect the DUT to the test fixture Set the desired de bias voltage via the HP IB Example of setting a de bias voltage of 10V OUTPUT 717 BI OEN Wait until the de bias voltage settles Example of programming a 10ms wait WAIT 10 Trigger the instrument via the HP IB OUTPUT 717 EX or TRIGGER 717 Read and print the measured values ENTER 717 A B PRINT A B Figure 3 31 Option 001 Internal DC Bias Sheet 2 of 3 3 72 Model 4277A SECTION HI 12 Set the bias voltage to QV via the HP IB 14 Remove the DUT from the test fixture Note OUTPUT 71
20. This supplement contains change information that explains how to adapt the manual to the newer instrument Model 4277A 1 19 In addition to change information the supplement may contain information for correcting errors called Errata in the manual To keep this manual as current and accurate as possible Hewlett Packard recommends that you periodically request the latest Manual Changes supplement The supplement for this manual is identified with this manual s print date and part number both of which appear on the manual s title page Complimentary copies of the supplement are available from Hewlett Packard If the serial prefix or number of an instrument is lower than that on the title page of this manual see Section VII Manual Changes 1 20 For information concerning a serial number prefix that is not listed on the title page or in the Manual Change supplement eontaet the nearest Hewlett Packard office Figure 1 2 Serial Number Plate 1 21 OPTIONS 1 22 Options are modifieations to the standard instrument that implement the user s special requirements for minor functional changes The 4277A has two options Option 001 Internal DC Bias Supply 0 40V Option 002 Comparator Handler Interface SECTION I 1 23 OPTION 001 1 24 Option 001 equips the standard 4277A with a built in de voltage source for biasing the device under test Output voltage is user selectable from 0 to 40V with 10mV 0V to
21. When the instrument is equipped Option 001 DO BIAS essesesesene Viendo dia R vaa 00V When the instrument is equipped Option 002 eontrol settings of the 16064A Comparator are as follows ENABLE sosrsssssoosoncssasoosssansoseceso OFF LC Z D G ESR G 7 L C Z LIMIT LOW HIGH LOW BIN NUMBER ee OC RUN s 44400000040000000000000 4000004000 OFF BIN LIMITS PPTP 950006086007909592900 005 blank 3 40 CONTINUOUS MEMORY 3 41 The continuous memory funetion of the 4277A automatically memorizes all front panel control settings when the instrument is turned off or experiences a power failure When the instrument is turned on the memorized settings are automatieally recalled Continuous memory is powered by a rechargeable 2 4V niekel cadmium battery that lasts for approximately 2 weeks when the instrument is turned off The battery is recharged while the 4277A is turned on Model 4277A Note When turned on the 4277A automatically performs a Check Sum Test as part of its turn on Self Test The Check Sum Test cheeks the contents of memory If incorrect E68 will be displayed on DISPLAY A and memory will be cleared The instrument will be set to the initial control settings refer to paragraph 3 38 3 42 OPEN and SHORT Zero Offset values refer to paragraph 3 51 and reference values for deviation measurements refer to paragraph 3 60 are also memorized by the continuous memory funetion On instruments eq
22. and BIN number data can be output as an 8 bit byte The displayed data is output as the equivalent decimal values of the resulting words The output format is shown in Figure 3 25 Model 4277A 3 96 PARAMETER SETTING 3 97 Test frequeney DC bias Option 001 and bin limits Option 002 can be set via remote program ming 1 Test Frequency Setting PR XXX X EN 1 1 Setting value in kHz Note When an illegal frequency that is within the instrument s frequency range is set the frequency below the illegal setting is automatically selected For examp e FR75 9EN 75 5kHz displayed on FREQUENCY DC BIAS DISPLAY 2 DC Bias Setting Option 001 only BI XX X EN 1 1 Setting value in volts Note If not set polarity sign is automatically set to plus 3 Comparator Limit Setting Option 002 only Low Limit LL XX XXX EN 1 High Limit LH XX XXX EN 1 1 Setting value The position of the decimal point must agree with the measurement range Unit is in accordance with the unit indicators of DISPLAY A or DISPLAY B Model 4277A SECTION III Note 1 ASCII mode Set using HP IB remote program code P0 Status and funetion data of DISPLAY A and DISPLAY B and status of A DISPLAY A B Comparator are each represented as one alphabetie character as listed in X X X NN NNN ENN Table 3 14 1 2 3 4 5 6 Note X N NNN at 5 g ST OS EBD When measureme
23. 0016mS 100kHz 0008nF 040 0007mS 0016nF 0014mS 200kHz 0015nF 0 0 0011mS F0 012mF 0 0022mS 202kHz 0017nF 0 0 008mS JANE 0 016mS 505kHz OOLinF 0 0 008mS 011nF t0 016mS l1MHz 0 0005nF 0 0 007mS LU 0010nF 014mS Test Frequency 10kHz x0 0009mH 20kHz 0 6 1H 20 2kHz 13uH 50 5kHz lluH 100kHz 09 uH 200kHz 06uH 202kHz 0 013uH S05kHz 0 011uH iMHz 009 uH Model 4277A SECTION IV PERFORMANCE TESTS 4 17 CAPACITANCE ACCURACY TEST 4 18 This test checks capacitance measurement accuracy for various combinations of test signal frequency test signal level and cable length The capacitance accuracy checks are made by connecting a standard capacitor to the instrument and comparing measurement results with the calibrated values of the standard Accuracies for dissipation faetors near zero are also checked in this test jA Capacitance accuracy check ranges cable length 0m 100pF 1000pF __ Tested range SZ Non applieable range for recommended capacitance standard 16048A c ooog UEM NC ERG Standar d Copacitor Figure 4 5 Capacitance Accuracy Test Setups CABLE LENGTH lm EQUIPMENT Standard Capacitors cessssssss sss erres seta e lpF HP 16381A 10pF HP 16382A 100pF HP 16383A 1000pF HP 16384A Terminations s on Viessesep vesaersssese OPEN 0S HP 16074A Short Standard Resistor Set Test leads with BNC connector HP 16048A BNC f f adapt
24. 1uF 100kQ 10uF 1MQ LOW HIGH INT MAN EXT DISPLAY A and DISPLAY B com binations are listed in the table below aie When DISPLAY A is set to Z DISPLAY B is auto matically set to D Range is fixed Range is automatically selected SE the instrument is set to a range which cannot make the measurement range is auto matically reset to the near est range capable of making the measurement This code only sets the trigger mode it does not trigger the instrument Model 4277A SECTION HI Table 3 13 Remote Program Codes Sheet 2 of 2 me o en R remm Code Data Ready OFF DO ON Dl Conssvdkop OFF Ko If the instrument is not equipped Tp with Option 002 an error wiil Enable ON El result if El is sent via the HP IB Comparator OFF G0 Run ON Gi Li L2 N1 If Data Ready is set to ON an SRQ signal is output when the measurement is completed Comparator L C Z input Limit D Q ESR G input Comparator Bin Number N2 N3 N4 N5 N6 N7 N8 These codes are used when set ting L C Z limits N9 Comparator Refer to paragraph 3 102 Limit Recall Comparator ER Comparator limits stored in all Limit Erase bins are cleared Output Data DA HP IB output data are erased Abort from the output buffer Output Data Displays A B or F1 Refer to paragraph 3 98 and Format Comparator Table 3 16 F2 F3 Display A Comparator F Output Data ASC
25. 2 Set the 4277 A s controls as follows TEST SIG LEVEL OPAC HIGH Test Frequency cccecccccescsacscccccvecscanscvecccnces 10kHz MEAS SPEED ne MED TRIGGER seo 4 ee ea sasne caecos sonos oo kk INT DC BIAS switch 4202 000400000400400000000000003004 OFF CABLE LENGTH Switel eser esse essea U Other Controls ssocsccerevecerccesesses Any setting 3 Press the SELF TEST key and then the FREQUENCY DC BIAS seleetor key 4 Press the FREQUENCY DC BIAS step control 6 or key several times until self test item number 8 appears in the FREQUENCY DC BIAS display as shown below FREQUENCY DC BIAS BEN NUMBER Model 4277A SECTION IV PERFORMANCE TESTS The values displayed on DISPLAY A and DISPLAY B should be within the following test limits DISPLAY A 0 0020 to 0 0048 DISPLAY B 0 0020 to 0 0048 Set the test frequeney to 100kHz and repeat step 5 Set the test frequeney to IMHz and repeat step 5 Press the FREQUENCY DC BIAS step control D key to select self test item 9 Press the FREQUENCY DC BIAS selector key and set the 4277A controls as listed in step 2 Leave the SELF TEST funetion set to on 10 The values displayed on DISPLAY A and DISPLAY B should be within the following test limits DISPLAY A 0 9990 to 1 0010 DISPLAY B 0 0010 to 0 0010 l1 Set the TEST SIG LEVEL and MEAS SPEED in accordance with Table 4 4 and Measurement Speed MED FAST
26. 3 53 SECTION HI 3 76 HP IB INTERFACE 3 77 The 4277A can be remotely controlled via the HP IB a carefully defined instrument interface which simplifies integration of programmable instruments and a calculator or computer into a system Note HP IB is Hewlett Packard s implementation of IEEE Std 488 Standard Digital Interface for Programmable Instrumentation 3 78 HP IB INTERFACE CAPABILITIES 3 79 The 4277A has eight HP IB interface functions as listed in Table 3 11 Table 3 11 HP IB Interface Capabilities Cede Interface Function HP IB Capabilities Source Handshake Acceptor Handshake Talker basic talker serial poll talk only mode unaddress to talk if addressed to listen Listener basic listener unaddress to listen if addressed to talk Service Request Remote local with local lockout Device Clear Device Trigger Interface functions provide the means for a device to receive process and tansmit messages over the bus The numeric suffix of the interface code indicates the limitation of the function as defined in Appendix C of IEEE Std 488 1978 3 80 CONNECTION TO HP IB 3 81 The 4277A ean be connected into an HP IB bus configuration with or without a controller ie with or without an HP ealeulator In an HP IB system without a controller the instrument functions as a talk only device refer to paragraph 3 86 3
27. 4277A 6 vLINE FUSE Holder Instrument s power line fuse is installed in this holder 100V 120V operation LAT 250V HP P N 2110 0007 220V 240V operation 750mAT 250V HP P N 2110 0360 T LINE Input Receptacle AC power cord connects to this receptacle 8 COMPARATOR HANDLER INTERFACE Connector Thirty six pin connector Option 002 instruments only connects the 16064A COMPARATOR HANDLER INTERFACE to the instrument SECTION HI 9 HP IB Control Switch This switch sets the instrument s HP IB address 0 30 data output format Fi F6 and interface eapability Addressable or Talk Only Speeifie information on this switch is given in paragraph 3 86 0 HP IB Connector Twenty four pin connector connects the instrument to an HP IB controller or other HP IB instruments via an HP IB eable Figure 3 2 Rear Panel Features Sheet 2 of 2 SECTION HI Note if an LED lamp or 7 segment display fails to light during the Display test contact the nearest Hewlett Packard Sales or Service Office for repairs Note If the instrument is equipped with Option 002 Comparator Handler Interface and if the 16064A Comparator Handler Interface is connected to the instrument all 16064A LED lamps except D Q ESR G and LIMIT LOW lamps will be lit during the Display test 3 11 ANALOG CIRCUIT TEST 3 12 The Ana og Circuit test is performed when the instrument s self test funetion is initiate
28. 54 Model 4277A 3 82 HP IB STATUS INDICATORS 3 83 The HP IB Status Indicators are four LED lamps loeated on the front panel When lit these lamps show the existing status of the 4277A in the HP IB system as follows SRQ SRQ signal from the 4277A to the controller is on the HP IB line Refer to paragraph 3 104 LISTEN The 4277A is set to listener TALK The 4277A is set to talker REMOTE The 4277 A is under remote control 3 84 LOCAL KEY 3 85 The LOCAL key releases the 4277A from HP IB remote eontrol and allows measurement eonditions to be set from the front panel The REMOTE lamp will go off when this key is pressed LOCAL eontrol is not available when the 4277A is set to local loekout status by the controller 3 86 HP IB CONTROL SWITCH 3 87 The HP IB Control Switch located on the rear panel has seven bit switehes See Figure 3 24 Each bit switch has two settings logical 0 down position and logieal I up position The left most bit switeh bit 7 determines whether the instrument will be addressed by the controller in a mu tidevice system or will funetion as a talk only device to output measurement data and or instruetions to an external listener e g printer DATA FORMAT GALK ONLY TALK ONLY AB e ecl ieee Figure 3 24 HP IB Control Switch Model 4277A When bit switch 7 is set to 0 the instrument is in ADDRESSABLE mode and bit switches 1 through 5 determine the instrum
29. Accuracy of reading G error in siemens number of counts see Tables A 4 and A 5 Note Use Table A 4 when the test frequency is 10kHz 100kHz or LMHz Use Table A 5 for all other frequencies Note ESR range and G range depend on the selected C range and test frequency Refer to Table A 7 Note Aceuracies obtained from Tables A 4 and A 5 are valid only for measurements made with the CABLE LENGTH switch set to 0m When the CABLE LENGTH switch is set to 1m add the errors listed in Table A 6 to the accuracies obtained from Tables A 4 and A 5 Note DISPLAY B function when ESR G is selected depends on the CIRCUIT MODE Model 4277A SECTION I Table 1 1 Specifications Sheet 6 of 17 Table A 4 C ESR G Aceuracies 10kHz 100kHz 1MHz only Test Frequency ESR G Range 10kHz 100kHz 1M 1MQ ESR See Note 1 10uS G 3 4anS 20nS 5 ESR 100k8 100 US ESR 10kQ ESR See Note 1 G 1 60anS 20nS 5 ESR See Note 1 G 1 6auS 0 2uS 5 Note 1 60uS 2US 5 ESR 1008 ESR 2 30amQ 20mQ 5 G l00mS G See Note 2 G ESR 5 Ram 6mQ 5 G See Note 2 Table A 5 C ESR G Aceuracies Test Frequency Range ESR G Range 10 1kHz to 20kHz 20 2kHz to 99 5kHz 101kHz to 200kHz 202kHz to 995kHz ESR IM See Note 1 See Note 1 See Note 1 See Note 1 10uS 3 l2inS 60nS 5 3 6anS
30. CSUR 580 EMOTE MI ISP LISTEN 1 TRLK 0 REMOTE 1 GSUB 560 DCRL LOCKOUT M DISP PRESS LOCAL KEY GTO AB Ga OT gt DISP LISTEN 1 TALKS REMOTE 1 GGZUB 380 LOCAL Plt DISP LISTEN 1 TALK 0 REMOTE O GOSUB SS REMOTE MI OUTPUT Mf T1 DISP iISTENs 1 THLKsO REMO TEs1 GUZUB 585 IF Ns1 THEN 340 ELSE 270 PRINT REMOTE LUCAL TEST FRIL DISP REM TE LOCRL TEST FRILL GOTO 330 PRINT REMOTE LOCAL TEST PRSS DISP REMOTEZLOCAL TEST PASS N Q MSP LISTENZTHLK TEST ENTER M1 A DISP LISTEN O TRLKsI REMOTE 1 GOSUB 584 OUTPUT M T1 DISP LIZSTENs1 TBRHLE O REPOTEs1 GOSLUB Sao IF Mei THEN 480 ELSE 819 PRINT LISTEN TALK TEST FAIL 390 DISP LISTEN TBLK TEST FR L 500 GOTO 530 510 PRINT LISGTEM TRLK TEST FASS ZO DISP LISTEN TALK TEST PRSS 530 PRINT EKD 240 DISP END 550 CLEAR M 560 LOCAL M SPO END 580 INPUT f 580 IF Ags N THEN Ne 500 RETURN Model 4277A SECTION IV PERFORMANCE TESTS Table 4 12 Controller Instruetions and Operator Responses for Test Program 1 Controller Instructions sxx 4277A HP IB TEST NO 1 svel ee cael SEQQ LISTEN 1 TALK 0 REMOTE 1 If the 4277A HP IB LISTEN 0 TALK 0 REMOTE 1 Status Indicators LISTEN 0 TALK 0 REMOTE 0 and Controller LISTEN 1 TALK 0 REMOTE 1 Display are the same press Y If Operator Response PRESS LOCAL KEY Press Local Key LISTEN 1 TALK 0 REMOTE 1 If the 4277A HP I
31. Comparator is eonnected to the rear panel Table 3 2 Number of Counts on DISPLAY B Lo pec 0 ER E s T 3 19 The FREQUENCY DC BIAS display provides direct readout of test frequency and if the instrument is equipped with Option 001 the voltage output from the internal de bias source If Option 001 is installed option annunciation 001 is displayed on this display each time the instrument is turned on If the DC BIAS ON OFF switeh is set to OFF when the de bias voitage is changed OFF will be briefly displayed on this displayed after the new value has been set Refer to paragraph 3 24 Also if the instrument is equipped with Option 002 BIN numbers are displayed on this display when the 16064A Comparator is enabled 3 20 ERROR CODES 3 21 Error eodes related to the ROM RAM test see paragraph 3 7 are listed in Table 3 3 If one of these errors is displayed on DISPLAY A when the instrument is turned on measurements ean not be made Note If E68 is displayed measurements ean be The instrument s continuous memory funetion however is disabled 3 22 Error eodes related to the Analog Circuit test see paragraph 3 11 are listed in Table 3 4 If one or more of these errors are displayed on DISPLAY A during Self Test the specifications listed in Table 1 1 are not guaranteed SECTION Hi Note If one of the error codes listed in Table 3 3 or Table 3 4 is displayed contact the nearest Hewlett Packard Sale
32. HP Model 16065A EXTERNAL VOLTAGE BIAS FIXTURE for high voltage bias applications up to 200V 6 Connect the transistor to the measurement terminals Figure 3 21 Semiconductor Device Measurement Sheet of 2 3 47 SECTION III Model 4277A 7 Monitor the bias voltage actually applied to 8 Set the DC BIAS ON OFF switeh on the front the transistor panel to ON and set the desired bias voltage Note Note If the 16065A is used close the lid If the P N iunetion becomes forward after you connect the transistor to the biased at either peak of the test signal measurement terminals Measurement correct measurement cannot be made cannot be made while the lid is open 9 Read the capacitance value from DISPLAY A Figure 3 21 Semiconductor Device Measurement Sheet 2 of 2 3 48 Model 4277A 3 71 EXTERNAL DC BIAS 3 72 The special biasing circuits and procedures for using external voltage or current bias required for certain capacitance or inductance measurements are given in Figure 3 23 The figures show sample circuits appropriate for 4277A applications When applying a de voltage to capacitors be sure the applied voltage does not exceed the maximum specified voltage of the capacitor and that the eapacitor is connected with correct polarity Note that the externally applied bias voltage is present at the Hpor and Ho terminals 3 73 Bias Voltage Settling Time When a measurement with de bias voltage superpo
33. LF a carriage 1 Status of L C 1 Z retuen and line feed signal is output after each field This is useful when 2 Status of D Q ESR G outputting data to eertain peripherals such as a printer 3 BIN number Note 4 Data Terminator The EOI signal is output with the LF signal Figure 3 25 Data Output Format for the 4277A Sheet 1 of 2 3 59 SECTION HI 2 PACKED BINARY mode Set using HP IB remote program code P1 T DISPLAY A B 3 60 lst byte and byte 3rd byte BB BB BBBB BBBBBBBB BBBBBBBB DQ G 4 4th byte 5th byte BBBBBBBB BBBBBBBB 5 B Status of DISPLAY A Status of DISPLAY B Measurement Range Value of DISPLAY A not including decimal point and unit Value of DISPLAY B not including deeimal point and unit Output data is the binary equivalent of the measured value Note The first byte ineludes DISPLAY A status DISPLAY B status and measurement range The value of the byte is output in decimal For example DISPLAY A status is OF 1 DISPLAY B status is blank 3 and measurement range is 5 see Table 3 15 the byte will be as shown below 01 0101 Lal ried l 5 The decimal equivalent of this is 117 This is the value that will be output Model 4277A 2 COMPARATOR Option 002 only BB BB 1 2 L 1 Status of L C 1Z 2 Status of D Q ESR G 3 BIN number Note Status data of DISPLAY A and DISPLAY B me
34. LOW 1MHz HIGH 0 52 m LOW C V Calibrated Vaiue xii Model 4277A SECTION IV PERFORMANCE TEST RECORD 4 23 INT DC BIAS SUPPLY TEST DC Bias Setting 20 1mV 0 imV 6 7895V 6 8505V 10 0999V 9 8801V 9 915V 10 085V 12 862V 12 538V 39 765V 40 235V 40 435V 39 565V xiii
35. No 2110 0011 for de bias input Accessories Available HP IB Cable 10833A 1m 10833B 2m 10833C 4m 10833D 0 5m _ Test Fixtures and Test Leads Refer to Table 1 3 Model 4277A SECTION I Table 1 2 Supplemental Performance Characteristics Sheet 1 of 2 Measurement Aceuracies Applicable at all test frequencies except 1MHz Additional Error for lm CABLE LENGTH Mode Add the errors listed in Table 1 Table 1 Inc 12 05 5 of reading 9 oe B 4 ESR G buf x 10 counts where a Full seale factor 8 Number of display digits f Test frequency in MHz Note Error doubles when LOW test signal level 20mVrms is used Use Table 2 for C measurements on the 1pF range Table 2 a Full seale factor 8 Number of display digits f Test frequency in MHz Note Table 2 does not apply when LOW test signal level 20mVrms is used Supplemental Performance Characteristics Use Table 3 for Z measurements on the 1MQ range Table 3 Measurement Function Additional Error of reading at Full seale factor f Test frequency in MHz Note Table 2 does not apply when LOW test signal level 20mVrms is used Use Table 4 when 2 meter cables are used to connect the DUT to the UNKNOWN terminals Table 4 Additional Error 9 ZAM je ome per e amp Full seale faetor 8 Number of display digits
36. PACKED BINARY Mode Data Status of DISPLAY A B Measurement Range Data Status of L C z for Comparator Data Status of D Q ESR G for Comparator Bin Number Normal Overflow Underflow Change Function or Blank luH 1pF 104H 10pF 100UH 100pF 100Q 1mH 1nF 1002 10mH 10nF 1kQ 100mH 100nF 10kQ 1H 1uF 100kQ LOUF 1M Bin IN HIGH LOW Embedded or Undefined Bin IN HIGH LOW Undefine Out of Bin BINI BIN2 BINS BIN4 BINS BIN6 BIN7 BIN8 BIN9 Model 4277A 3 98 OUTPUT DATA FORMAT 3 99 The 4277A ean output measurement data to a eontroller or ean output data directly to an external listener device i e printer There are six Output Data Formats Fl through F6 The contents of the output data for each format are listed in Table 3 16 Note In ADDRESSABLE mode only Fl through F4 can be set by HP IB remote control Output data can be in either ASCII mode or PACKED BINARY mode Also in ADDRESSABLE mode bit switeh settings have no relation to Output Data Format Note In TALK ONLY mode any Output Data Format Fl through F6 ean be set by HP IB Control Switch settings bit 1 through bit 3 Also in TALK ONLY mode data ean be output in ASCII mode only SECTION HI Note Comparator data is output when the eomparator is in RUN mode When F1 F3 or F5 is seleeted if comparator is not in RUN mode or if the comparator is not eonneeted to the instrument contents of output data is Typ
37. Personal Computer or 00085 15003 I O ROM 2 9836A Desktop Computer 3 82937A HP IB INTERFACE SECTION IN 3 66 Model 4277A Tabie 3 17 Sample Programs R emo l ena Program 1 5 27 Remote control and data output program 2 5 28 How to use remote program code UIN U 3 3 29 How to input low and high bin limits for the Comparator How to use remote program code BER TT Sample Program 1 Description This program has three capabilities 1 Control of the 4277A via the HP IB 2 Trigger of the 4277A via the HP IB 3 Data output from the 4277A via the HP IB Program 10 20 30 40 50 60 70 80 90 100 1 2 3 REMOTE 717 CLEAR 717 DIM A 50 OUTPUT 717 A2B1T2POF1 1X2 3 OUTPUT 717 FR100 EN 4 OUTPUT 717 EX 5 ENTER 717 A DISP A PRINT A END HP IB INTERFACE Select Code 82937 A or 98034A HP IB Address of the 4277 A Program codes for the 4277 A refer to Table 3 13 Program eodes for parameter setting of the 4277A refer to paragraph 3 96 This is equivalent to TRIGGER 717 Figure 3 27 Sample Program 1 Sheet 1 of 2 Model 4277A SECTION Ui If program code PL is used refer to the following program Program 10 REMOTE 717 20 CLEAR 717 30 OUTPUT 717 A2BIT2P1F1 40 OUTPUT 717 EX 50 ENTER 717 USING B W W A B C W 60 DISP A B C 70 PRINT A B C 80 END ENTER terminator can also
38. Program 10 REMOTE 717 20 DIM A L30 30 OUTPUT 717 E1G0 40 FOR i 1 TO 9 50 OUTPUT 71T LIN SL SER 60 ENTER 717 A 70 PRINT A 80 NEXT I 90 OUTPUT 717 L2LR 100 ENTER 717 A 110 PRINT A 120 END Figure 3 30 Sample Program 4 3 69 SECTION fH 3 108 OPTIONS 3 109 Options are standard modificaions to the instrument that implement user s special requirements for minor funetional changes Operating instructions for the 4277A s options except rack mount and handle installation kit options and associated information are described in the following paragraphs 3 110 Two options are available as listed in the following tables Internal DC Bias 002 Comparator Handler Interface Option eontents are as follows 001 A22 Internal DC Bias Board Assembiy 002 Comparator Handler Interface Kit 3 111 OPTION 001 INTERNAL DC BIAS 40V to 40V 3 112 Option 001 adds an internal de bias supply variable from 00 volts to z40 0 volts The de bias voltage ean be controlled manually from the front panel or remotely via the HP IB Manual control and de bias applications under HP IB eontrol are deseribed in Figure 3 31 The internal de bias souree has two ranges and a maximum resolution of l0mV Refer to Table 3 18 Output from the bias source is automatically set to OV each time the instrument is turned on or when the CLEAR command is sent via the HP IB DC bias voltage is applied to t
39. Select Switch This switch selects the DC bias source that will be used for biasing DUTs connected to the UNKNOWN terminals i INT On instruments equipped with Option 001 DC BIAS the DC voltage output from the internal DC bias source will be applied to the DUT when the DC BIAS Switch 19 in Figure 3 2 is set to ON No DC bias voltage will be applied to the DUT DC voltage provided by an external voltage source connected to the EXT INPUT INT MONITOR Connector will be applied to the DUT regardless of the setting of the DC BIAS Switch in Figure 3 2 Maximum allowable voltage is 40V Model 4277A 3 EXT INPUT INT MONITOR Connector The funetion of this connector depends on the setting of the DC BIAS Select Switeh 2 When the DC BIAS Seleet Switeh is set to EXT this connector is the input terminal for an external DC voltage source When the DC BIAS Seleet Switeh 2 is set to INT this connector is the monitor output terminal for the internal DC bias souree Option 001 instruments only 4 EXT TRIGGER Connector This eonneetor is for external trigger input TRIGGER key on front panel should be set to MAN EXT Specifie information is provided in paragraph 3 74 5 LINE VOLTAGE SELECTOR Switch This switeh selects the appropriate ae operating voltage Selectable voltages are 100V 120V 1056 and 220V x1096 240V 5 10 48 66Hz Figure 3 2 Rear Panel Features Sheet 1 of 2 Model
40. Test Signal Level S Display A Display B Display A Display B verify that the displayed values are within the test limits given in the table Table 4 4 Self operating Test Item 9 Test Limits High 1 0 0010 040 0010 1 0 0050 040 0050 Low 120 0020 040 0020 1 0 0100 040 0100 12 Set the test frequency to 100kHz and 1MHz and repeat steps 10 and 11 for each frequeney 13 Press the SELF TEST key to release the self test funetion and set the 4277 A s controls as follows Test frequency iGo W IMHz TEST SIG LEVEL seda idac Kadi HIGA MEAS SPEED ssesssssrsusossaassa PA A T MED TRIGGER sss sss T dY INT DISPLAY A function daiji PNA E D DISPLAY B function sei iesus eve Perl w G C RANGE es ELTA gta IpF DC BIAS switch esssessseesenas M sa OFF CABLE LENGTH sosie i c KRE ERRA 9 Other COnNtrolS ATA ES ENR OWA Any setting SECTION IV Mode 4277A PERFORMANCE TESTS 4 10 14 i5 16 T3 Set the self test item 3 using the procedure deseribed in steps 3 and 4 The value displayed on the DISPLAY A should be within 0 and 200 counts Disconnect the Open 0S termination and connect a 10pF standard capacitor directly to the UNKNOWN terminals as shown in Figure 4 3 b Set the DISPLAY B function to D and press the LC Z RANGE selector key once to select the 10pF range Note To verify the selected range temporarily release
41. The 16064A outputs four types of signals to the component handler Comparison result signals LCHI LCIN LCLO DQHI DGIN DQLO Bin number signals BIN1 BIN9 OUT OF BIN DUT change signal INDEX 4 Comparison complete signal EOM Type 1 signals correspond to the LOW IN HIGH LED lamps on the 16064A keyboard Type 1 signals are divided into two groups of three When the signal line corresponding to the lit LED lamp goes LOW the other signal lines in that group stay HIGH Type 2 signals correspond to the bin numbers displayed on the FREQUENCY DC BIAS display When the signal line corresponding to the displayed bin number goes LOW the other signal lines stay HIGH The type 3 signal INDEX goes LOW when the 4277A has completed the analog portion of the measurement The DUT can be disconnected from the measurement terminals and the next one can be connected Comparison results however are not yet valid The type 4 signal EOM goes LOW when the 4277A has completed the measurement and the comparator has made a judgement Comparison results are now valid Model 4277A 7o Handier All signals are negative true and all are from TTL open eolleetor outputs Pull up resistors are installed TTL voltage levels or higher voltages up to 30V are possible by changing a few jumper settings inside the 16064A Refer to the 16064A Operating Note for details Signals sent from the external component handle
42. be within the test limits given in the table 4 19 SECTION IV Model 4277A PERFORMANCE TESTS Table 4 9 Phase Accuracy Tests Phase DISPLAY B Test Limits Test Frequency TEST SIG LEVEL HIGH TEST SIG LEVEL W 4 23 INT DC BIAS VOLTAGE ACCURACY TEST OPTION 001 4 24 This test verifies that Option 001 Internal DC BIAS Supply applies the specified bias voltages to the deviee under test fm H 5 a MODODOJO DGOOO DOG Figure 4 6 Option 001 INT DC Bias Accuracy Test Setup EQUIPMENT DU Voltmeter serssesosesesseeseos PEE AE MS HP 3478A Test Fixture s s essssesse x cE E AO CS dd ELE esos HP 16047A PROCEDUE 1 Intereonneet the 4277A 16047A and 3478A as shown in Figure 4 6 Note Do not connect a DUT to the 16047A CAUTION BEFORE OPERATING DC BIAS WITCH VERIFY THAT DC BIAS VOLTAGE IS SET TO ZERO VOLTS 4 20 Mode 4277A SECTION IV PERFORMANCE TESTS aa zzz ee 2 Set the 4277A s controls as follows DC BIAS selector switch rear panel INT OPTION 001 DC BIAS switch front panel Mais ON DEST IG DEVISE Mester au eve ox COD a LOW Other GontPOls wisi anya cali ii Any setting 3 Set the de bias voltage in accordance with Table 4 10 The voltage readings on the 3478A should be within the test limits given in the table Table 4 10 INT DC Bias Voltage Test Limits DC Bias Setting Test Limits 0 LmV 20 1mV 6 7895V 6 8505V 9 8801V 10 0999V 9 915V
43. both this test and dissipation factor cheeks associated with the Capacitance Accuracy Test SECTION IV 4 3 SECTION IV ACCURACY TEST STANDARDS 1 Standard Capacitors The HP 16380A Series Standard Capacitors featuring the four terminal pair configuration are recommended for use as performance test standards The four standard capacitors 16381A 1pF 16382A 10pF 16383A 100pF and 16384A 1000pF are calibrated at 0 01 accuracy at IkHz and have capacitances within 0 1 of their nominal values For values up to 10MHz an extrapolation of the calibrated values at lkHz is used This is based on the careful consideration of their inherent residual parameter values and on the actual test measurement to verify the frequency dependency of the values Capacitance values at frequencies up to 10MHz are read from the graph given on the data sheet of each standard Note A high capacitance standard useable in high frequency region is unavailable This is because a 10uF capacitor for example has a low impedance value of 0 162 at 100kHz A capacitance standard would have in addition residual impedance which could not be disregarded when compared to the pure impedance of 0 160 Thus an attempt to eonduet tests which would use the standard capacitor at the higher operating frequency ranges is not practicable 2 Standard Resistors The standard resistors used for accuracy checks should be nearly pure resistances and should maintain
44. data should be 68 01000100 If the instrument fails SELF TEST it should be 84 01010100 Ground EXT TRG Connector on rear panel momentarily PASS SRQ Status Byte data should be 72 01001000 SRQ Status Byte data should be 80 01010000 the timing of connecting the the timing of connecting 4 31 PERFORMANCE TEST RECORD Hewlett Packard Model 4277A LCZ METER Tested by Serial Number Date 4 9 TEST FREQUENCY ACCURACY TEST Frequency setting 10 0kHz 9 999kHz 100kHz 99 99kHz 202kHz 201 98kHz 500kHz 499 95kHz 1 00MHz 0 9999MHz 4 11 TEST SIGNA LEVEL ACCURACY Test Signal Level HIGH l Vrms Frequency 10kHz 400kHz 4 1MHz i Test Signal Level LOW mVrms Frequency 10kHz 25 100kHz 24 1MHz 22 10 001kHz 100 01kHz 202 02kHz 500 05kHz 1 0001MHz e Kod Ka 4 13 SELF OPERATING TEST SELF TEST 8 Frequency 10kHz DISPLAY DISPLAY 100kHz DISPLAY A DISPLAY DISPLAY DISPLAY SECTION IV Model 4277A PERFORMANCE TEST RECORD Results Paragraph 4 13 SELF OPERATING TEST Cont d SELF TEST 9 Frequency 10kHz Measurement Speed MED Test Signal Level HIGH DISPLAY A 1 0010 ONE 0 9990 DISPLAY B 0 0010 ARN 0 0010 LOW DISPLAY A 1 0020 0 9980 DISPLAY B l 0 0020 0 0020 Measurement Speed FAST Test Signal Level HIGH DISPLAY A 1 0050 0 9950 DISPLAY B 0 0050 0 0050 LOW DISPLAY A 1 0100 DEEP 0 9900 DISPLAY B 0 0100 0 0100 Frequency 100kHz Measurement Spee
45. extra copy of the Operation and Service Manual 1 3 SECTION I Model 4277A Table 1 1 Specifications Sheet 1 of 17 SPECIFICATIONS Parameters Measured C capacitance L inductance IZ impedance D dissipation factor Q quality factor ESR equivalent series resistance G conductance g phase angle HIGH SPEED C at 1MHz only HIGH SPEED L at 1MHz only A deviation Measurement Cireuit Modes Auto Series ete and Parallel T Parameter Combinations Circuit Mode Parameter Combination C D C Q C ESR L D L Q L ESR z 0 HIGH SPEED C HIGH SPEED L Series o L3 o Paraliei eoe Measurement Speed Modes SLOW MED and FAST C D C Q C G L D L Q L G z 0 HIGH SPEED C HIGH SPEED L Displays Measurement Display p Speed Mode Digits AR Display SLOW 4 1 2 FAST 3 1 2 1999 counts Number of display digits depends on the test frequency the test signal level and the measurement range 19999 counts Measurement Terminals 4 terminal pair eonfiguration with guard terminal Ranging Modes Auto and Manual UP DOWN keys Test Frequencies Test Frequency Range Resolution 10kHz to 20kHz 100Hz 20kHz to 50kHz 200Hz SOkHz to 100kHz 500Hz 100kHz to 200kHz LkHz 200kHz to 500kHz 2kHz 500kHz to 1MHz 5kHz Frequeney Control Modes SPOT 10kHz 100kHz IMHz COARSE 10 freq points decade FINE maximum resolution Frequency Accuracy 0 01 Test
46. for selecting the correct power cable eontaet the nearest Hewlett Packard office 2 14 INTERCON NECTIONS 2 15 When an external de bias source is used set the DC BIAS select switeh on the rear panel to EXT The output from the external bias souree should be eonnected to EXT INPUT INT MONITOR eonneetor The external de bias fuse is installed in EXT DC BIAS FUSE Hoider on rear panel to protect the instrument from excessive current Fuse rating is as follows 100V 120V OPERATION 100V 120V Bia 220V 240V 220V 240V OPERATION 100V 120V 220V 240V Line Voltage 100V 120V 220V 240V Model 4277A 1 16A 250V HP Part No 2110 0011 CAUTION MAKE SURE THAT ONLY FUSES OF THE REQUIRED RATED CURRENT AND OF THE SPECIFIED TYPE ARE USED FOR REPLACEMENT THE USE OF MENDED FUSES AND THE SHORT CIRCUITING OF FUSE HOLDERS MUST BE AVOIDED 2 16 OPERATING ENVIRONMENT 2 17 Temperature The instrument may be operated in temperatures from 0 C to 55 C 2 18 Humidity The instrument may be operated in environments with relative humidities to 95 at 40 C However the instrument must be protected from temperature extremes which cause condensation within the instrument 2 19 INSTALLATION INSTRUCTIONS 2 20 The HP Model 4277A can be operated on the bench or in a rack mount The 4277A is ready for bench operation as shipped from the factory For bench operation a two leg instrument stand is used F
47. impedance vector phase angle of the DUT has been accurately detected EQUIPMENT Standard ResistofS cassccsrcccccescscsacccocasacess YES 102 HP 16074A 08 Standard Resistor Termination essssrreosssssreosneosesasee ee OPEN 05 j Set Note The resistors used as references in this test have been designed to maintain an extremely low residual reactance at frequencies up to IMHz The 02 termination has been specially designed for use with the 0 12 12 and 102 standard resistors and provides an optimum termination impedance for the short offset adjustment to be made before performing tests with these standards l PROCEDURE 1 Set the 4277A s controls as follows DISPLAY A function waciki Z CIRCUIT MODE zasieki sE wasi AUTO LEIZA RANGE aaa woli AUTO MEAS SPEED ieeivcetcasisescsessks asvbecuveco uube MED TRIGGER usssvexseFekasa RICE TOR SETDSNIN 1 d CABLE LENGTH SwIteli sa eee anaa na nanas essa DC BIAS SWILOh canto iva OFE Other COntrols nossa pa veo suse aen eese Any setting 2 Perform OPEN and SHORT zero offset Adjustment as deseribed in steps 1 3 6 and 7 of paragraph 4 15 Note Be sure to use the OPEN and 00 termination of the 16074A for zero offset Adjustment DO NOT use the Short termination 3 Disconnect the 09 termination and connect the 109 standard Resistor direetly tothe UNKNOWN terminals 4 Set the test frequency and TEST SIG LEVEL in accordance with Table 4 9 Phase angle readings should
48. is 8508 on the 10008 range a is 0 85 Additional Measurement Error for IZ and gat IMHz Table C 3 5 l a 100k2 Note 1 Tables C 1 and C 2 are applicable under the following conditions 1 CABLE LENGTH 0m 2 Test Signal Level HIGH 1Vrms 3 Sample s D Value 0 1 4 Zero offset adjustment has been performed with the OPEN and SHORT terminations of the Model 16074A Error doubles when LOW test signal level 20mVrms is used Note 2 Note 1 Table C 3 is applicable under the following conditions 1 Test Frequency 1MHz 2 CABLE LENGTH 0m 3 Test Signal Level HIGH 1Vrms Sample s D Value lt 0 1 5 Test Lead Model 16048A and 16048B 6 Zero offset adjustment has been performed with the OPEN and SHORT terminations of the Model 16074A Error doubles when LOW test signal level 20mVrms is used Note 2 SECTION I Mode 4277A Table 1 1 Specifications Sheet 17 of 17 OPTIONS Option 001 Internal DC Bias Equips the standard 4277A with a variable 0 to 40V de voltage source for biasing DUTs connected to the UNKNOWN terminals Output voltage can be set from the front panel or via the HP IB Bias Control Range and Accuracy Voitage Range Step Temperature Accuracy WET 237024500 16 0 40 0V 100nV 0 C 55 C 1 of rdg 70mV 23 css C 0 3 of rdg 10mV 0 C 55 C 1 of rdg 20mv i Op nO ete e Pe 9 99 01v 2
49. numbers enclosed in parentheses apply when Test Signal Level is LOW Figure 3 4 Measurement Ranges and Number of Display Digits Sheet 10 of 16 3 26 Model 4277A SECTION III SLOW FAST Full Scale Factor Full Scale Factor 100k Test Frequency liz Test Frequency Hz Note Numbers not enclosed in parentheses apply when Test Signal Level is HIGH numbers enelosed in parentheses apply when Test Signal Level is LOW Figure J Figure 3 4 Measurement Ranges and Number of Display Digits Sheet 11 of 16 3 27 SECTION HI Model 4277A NUMBER OF DISPLAY DIGITS FOR ESR AND G IN C ESR G MEASUREMENT ESR G Test Frequency Hz Range 10 0k to 18 0k 18 1k to 19 9k 20 0k to 1 00M 1M2 10u8 4403 ds 302 100k0 100u8S 10k2 1mS 1k 10m 1000 100mS 3 3 2 3 3 2 100 1S Note 1 ESR and G ranges depend on the selected C range 4 4 3 4 463 444 3 3 3 3 4 4 3 4 4 3 2 Numbers not enclosed in parentheses apply when Test Signal Level is HIGH numbers enelosed in parentheses apply when Test Signal Level is LOW NUMBER OF DISPLAY DIGITS FOR ESR AND G iN L ESR G MEASUREMENT ESR G Test Frequency Hz Range 10 0k to 18 0k 18 1k to 19 9k 20 0k to 1 00M 100k0 100u8 10kQ 1mS 354822 98500 1kQ 10mS 1000 100mS 4 4 3 4 4 3 4 4 3 3 3 3 4 4 3 4 4 3 102 18 4 4
50. parentheses apply when Test Signal Level is HIGH numbers enclosed in parentheses apply when Test Signal Level is LOW Figure C Figure 3 4 Measurement Ranges and Number of Display Digits Sheet 4 of 16 Model 4277A SECTION Ili SLOW FAST Full Scale Factor Full Scale Factor 100k 100k Test Frequency Hz Test Frequency Hz Note Add one digit at 10k 100k and L MHz when Test Signal Level is LOW Figure D SLOW FAST Fuli Scale Factor Full Scale Factor 100k Test Frequency Hz Test Frequency Hz Figure E In Figures D and E numbers not enclosed in parentheses apply when Test Signal Level is HIGH numbers enelosed in parentheses apply when Test Signal Level is LOW Figure 3 4 Measurement Ranges and Number of Display Digits Sheet 5 of 16 3 21 SECTION III Model 4277A NUMBER OF DISPLAY DIGITS FOR INDUCTANCE Test Signal Level HIGH Test Frequency Hz Inductance 10 1k to 202 k to 101k to 202k to See Figure Gy See Figure G2 See Figure F See Figure G2 Fi luH 100uH See Figure F l0uH 4 3 3 4 4 3 44323 4 4 3 Note Shaded areas indicate that measurement cannot be performed Test Signal Level LOW Test Frequency Hz Inductance 10 1k to 20 2k to 101k to 202
51. test signal current varies over a broad frequency region around the resonant frequencies Additional errors due to the resonance increase in proportion to the square of the measurement frequency below resonant frequency and can be theoretically approximated as follows Parallel Resonance i 7 Series Resonance Figure 3 16 Effect of Resonance in Sample Example 3 42 C ERROR w L Cx 100 L ERROR z g CpLx 100 where w 9mf f test frequency Cx Capacitance value of sample Lx Inductance value of sample At low frequencies Lo and Co affect measured inductance and capacitance values respectively as simple additive errors These measurement errors cannot be fully eliminated by the ZERO offset adjustment which compensates for residual factors inherent in the test fixture This is because L o and Co are peculiar to the component being measured Their values depend on component lead length and on the distance between the sample and test fixture The measurement results then are substantially the sample values including the parasitic impedances present under the conditions necessary to connect and hold the sample Model 4277A 3 57 MEASURED VALUES AND BEHAVIOR OF COMPONENTS 3 58 A component s measured value and its nominal value can and often do differ considerably because of various electromagnetic effects for example skin effeet of a conductor the ferromagnetic properties of inductors
52. the residual inductance of the eomponent s leads and Ro is lead resistance Go is the conduetanee between the leads and Co is the sum of all stray capacitances shown in Figure 3 13 Reaetive factors in the residual impedance and susceptive factors in the stray admittance have a greater effect on measurements made at higher frequencies Measured impedance Rm jXm is jXm e R Ii RGo GoX Rm fi uCoX F RGo RCo GoXj RO X 1 WC X wCoR 1 WCOX RGo 4 oRCo GoX WLOJ Figure 3 14 Equivalent Cireuit Including Residual Impedance SECTION IH Model 4277A Effect of residual impedance on C G measurement Cm Cx 1 w LoCx 2RoGx LoGx Cx Gm x Gx 1 2w LoCx RoGx w RoCx Gx Effect of stray admittance on L ESR measurement Lm x Lx 1 2GoRx w CoLx CoRx Lx Rm Rx 1 GoRx 2u CoLx w Lx Go Rx Figure 3 15 Effects of Residual Impedance 3 56 Figure 3 15 shows the effect of residual impedanee on C G measurement and the effect of stray admittance on L R measurement Generally L o resonates with the capacitance of the sample series resonance and Ce resonates with the inductance of the sample parallel resonance respectively at a specific high frequency Thus the impedance of the test sample will have a minimum value corresponding to resonant peaks as shown in Figure 3 16 The presence of Le and Co causes measurement errors as the phase of the
53. to the lm position Note When the HP 16048D Test Leads standard 2m test eable is used with the 4277A the CABLE LENGTH switch must be set to the 1m position and the SA SELECT switeh S1 on the Al Logie board must be set as shown in Figure 3 11 The setting of this switch ean be changed only when the instrument is turned off SA SELECT SW S1 e Figure 3 11 SA SELECT Switch Settings for 2m Test Leads SECTION HI Note If test leads longer or shorter than the standard 1m or 2m test leads are used the additional error is proportional to the square of the frequency As the characteristie impedance of the test leads is also a factor in the propagation loss and phase shift and of resultant measurement error use of different type test leads must be avoided Use only the standard test leads available from Hewlett Packard 3 51 ZERO OFFSET ADJUSTMENT 3 52 The test fixtures and test leads used to connect samples to the instrument s UNKNOWN terminals have inherent residual impedance and stray admittance which unless compensated for in some way affect measurement aceuracy To minimize the effects of these residuals and strays the 4277A is equipped with OPEN and SHORT Zero Offset Adjustment funetions that can be executed from the front panel or via the HP IB Each Zero Offset Adjustment is performed at the following frequencies IMHz 900kHz 700kHz 505kHz 202kHz 100kHz 50 5Hz 20 2Hz 1l0kHz Zero Offset data fo
54. 0 5kHz HIGH C LOW 0 006K 012kQ 006k 012kQ lt 100kHz HIGH LOW 0 006kQ 012k9 006k 012kQ aa C V 0 006kQ 012k2 200kHz HIGH Gy LOW 0 006k9 012kQ 505KHz HIGH C LOW 0 006k 2 012kf C V 0 006kQ 012kQ e 1MHz HIGH LOW 0 006k8 012k C V 0 006k82 O12kQ Ci ci e ocu 10k Range Frequency Test Signal 10kHz HIGH LOW 20kHz HIGH LOW 50 5kHz HIGH LOW 100kHz HIGH LOW 200kHz HIGH LOW C V Calibrated Value xi SECTION IV Model 4277A PERFORMANCE TEST RECORD Paragraph EN ae OMNEM 4 19 RESISTANCB ACCURACY TEST Cont d 50 5kHz HIGH 0 06k8 LOW C V Q I2kQ CY lt 0 06k8 et 0 12k9 1MHz HIGH i 0 06k82 LOW C V 0 12kQ 0 06k amp G 0 12kQ t 100k Range Frequency Test Signal 10kHz HIGH C V 0 6kQ LOW 20kHz HIGH Ve 0 6kQ LOW 50 5kHz HIGH C V 0 6kQ LOW 100kHz HIGH C V 0 6k2 LOW PHASE ACCURACY TEST Frequency Test Signal 10kHz HIGH 9452 LOW 20kHz HIGH 0 52 0 52 LOW 50 5kHz HIGH 0 52 lt U 52 LOW 100kHz HIGH 0 52 0 52 LOW 200kHz HIGH 0 52 0 52 LOW 505kHz HIGH 0 52 0 52
55. 048A or 16048B 1 of reading 100us Zero offset adjustment has been performed E with the OPEN and SHORT terminations of the Model 16074A Note 2 Error doubles when LOW test signal level 20mVrms is used Model 4277A Table 1 1 Specifications Sheet 14 of 17 Table B 7 ESR G Range Selection inductance Test Frequency Range Range He 1 ESR 100yH SECTION I SECTION I Model 4277 A Table 1 1 Specifications Sheet 15 of 17 Impedance Measurement Accuracy Z 8 Measurement Accuracy Z Aeeuraey of reading number of eounts see Tables C l and C 2 8 Aeeuracy 9 error in degrees number of eounts see Tables C 1 and C 2 Note Use Table C 1 when the test frequency is 10kHz 100kHz or 1MHz Use Table C 2 for all other frequencies Note Aceuracies obtained from Tables C l and C 2 are valid only for measurements made with the CABLE LENGTH switch set to Om When the CABLE LENGTH switeh is set to 1m add the errors listed in Table C 3 to the aceuracies obtained from Tables C 1 and C 2 Table C l Z 6 Aceuracies Table C 2 Z 6 Aceuracies 10kHz 100kHz 1MHz only Test Frequency Range z Range 10 1kHz to 99 5kHz lOlkHz to 995kHz Model 4277A SECTION I Table l l Specifications Sheet 16 of 17 Equations in Tables C L and C 2 represent IZ Accuracy 8 Accuracy Full scale factor measured Z value full scale Z value For example when measured Z value
56. 1 Al LOGIC Board Troubleshooting Flow Diagram In Signature Set 9 2 change the signature of A22U2 pin 15 to 810P CHANGE 1 Page 2 5 Figure 2 3 Change the Figure as shown on the next page Reference HP Part 2 66 gt c A2C97 0160 4833 CAPACITOR FXD 022uF 10 a exe A2C100 0160 5493 CAPACITOR FXD luF 10 63V b New Item A Add D Delete C Change Handle Kit 5061 9690 Rack Flange Kit 5061 9678 Rack Flange amp Handle Kit 5061 9684 L Remove adhesive backed trim strips from side at right and left front of instrument 2s HANDLE INSTALLATION Attaeh front handle to sides at right and left front of instrument with serews provided and attach trim 2 to handle RACK MOUNTING Attaeh raek mount flange 2 to sides at right and left front of instrument with serews provided HANDLE AND RACK MOUNTING Attach front handle 3 and rack mount flange 5 together to sides at right and left front of instrument with screws provided When rack mounting 3 and 4 above remove all four feet lift bar at inner side of foot and slide foot toward the bar Figure 2 3 Rack Mount Kit Model 4277A SECTION I SECTION I GENERAL INFORMATION 1 1 INTRODUCTION 1 2 This operation and service manual eontains the information required to install operate test adjust and service the Hewlett Packard Model 4277A LCZ Meter Figure 1 1 shows the instrument and its supplied acce
57. 12 Open the cover of the 16065A Note When the cover of the 16065A is opened the charge on the sample is discharged through two paralleled 202 resistors Figure 3 23 External DC Bias Sheet 2 of 4 3 51 SECTION I Model 4277A 13 Remove the sample from the 16065A Note Note The test signal will appear at the DC BIAS MONITOR connector This does Use a stable de voltage source not affect measurement results however EXTERNAL DC CURRENT BIAS OPERATION lt 35mA DC POWER SUPPLY AC Bypass Capacitor DC bias eurrent ean be applied to the sample 7 Connect the sample to the test fixture or through the UNKNOWN terminals by connecting test leads a de voltage source to the instrument The procedure for making inductance measurements 8 Gradually increase the de voltage source using current biasing is given below output voltage until the desired bias eurrent as indicated on the de ammeter is PROCEDURE obtained l Set the DC BIAS select switch on the rear CAUTION panel to EXT DO NOT ALLOW THE BIAS CURRENT 2 Conneet an external de voltage source and TO EXCEED 35mA AND DO NOT a de ammeter for current monitoring to ALLOW THE OUTPUT VOLTAGE the EXT INPUT INT MONITOR connector FROM THE EXTERNAL DC VOLTAGE on the rear panel as shown in the diagram TO EXCEED SOURCE 40V IF CURRENT EXCEEDS 35mA OR IF 3 Connect a test fixture or test leads to the V
58. 2 21 Installation of Options 907 908 and 909 2 22 The 4277A can be installed in a rack and be operated as a component of a measurement system Rack mounting information for the 4277A is presented in Figure 2 3 2 23 STORAGE AND SHIPMENT 2 24 ENVIRONMENT 2 25 The instrument may be stored or shipped in environments within the following limits Temperature e 40 C to 470 C Humidity e to 95 at 40 C The instrument must be proteeted from temperature extremes which cause condensation inside the instrument 2 26 PACKAGING 2 27 Original Packaging Containers and materials identical to those used in factory packaging are available from Hewlett Packard if the instrument is being returned to Hewlett Packard for servicing attach a tag indicating the type of service required return address model number and full serial number Also mark the container FRAGILE to assure eareful handling In any correspondence refer to the instrument by model number and full serial number 2 28 Other Packaging The following general instructions should be used for re packing with commercially available materials a Wrap instrument in heavy paper or plastic If shipping to Hewlett Packard office or service center attach tag indicating type of service required return address model number and full serial number b Use strong shipping container A double wall carton made of 350 pound test material is adequate e Use en
59. 3 3 3 2 Note 1 ESR and G ranges depend on the seleeted L range 2 Numbers not enclosed in parentheses apply when Test Signal Level is HIGH numbers enclosed in parentheses apply when Test Signal Level is LOW Figure 3 4 Measurement Ranges and Number of Display Digits Sheet 12 of 16 Model 4277A SECTION MI DISPLAY INDICATION FOR QUALITY FACTOR 9 D 4 digits z 0100 to 0355 100 to 30 0334 to 1 9999 29 9 to 0 5 Note Q is the reciprocal of D D 3 digits 001 to 003 1000 to 333 004 to 010 250 to 100 011 to 033 90 9 to 30 3 Note Q is the reciprocal of D Figure 3 4 Measurement Ranges and Number of Display Digits Sheet 13 of 16 3 29 SECTION III Model 4277A NUMBER OF DISPLAY DIGITS FOR IMPEDANCE M z Range Test Frequency Hz 10 0k to 18 0k 18 1k to 19 9k 20 0k to 99 5k 100k to 1 00M See Figure L LOOK 10kQ See Figure K 4 4 3 4 3 3 404 3 3 3 3 4 4 3 4 3 3 4 403 4 4 3 EM REKE Note Numbers not enclosed in parentheses apply when Test Signal Level is HIGH numbers enelosed in parentheses apply when Test Signal Level is LOW NUMBER OF DISPLAY DIGITS FOR PHASE ANGLE iz Range Test Frequency Hz 10 0k to 1 00M 100kQ 5 7 See Figure K See ik M Figure 3 4 Measurement Ranges and Number of Display Digits Sheet 14 of 16 3 30 Model 4277A SECTION III
60. 5 9050 005 5 n 25 BnH 5 25 6nH 5 8 0005 a 0026 34 0005 0 0016 5 3 0005 8 0012 s 1 205 19 b 20 S 8nH 10 3 gt ni 10 4 0005 005 5 p 0005 a 005 5 0005 005 5 200kHz SQ kHz Miz Note 1 Tables B l and B 2 are applicable under the following conditions 1 CABLE LENGTH 0m 2 Test Signal Level HIGH 1Vrms 3 Sample s D Value lt 0 1 4 Zero offset adjustment has been performed with the OPEN and SHORT terminations of the Model 16074A Note 2 Error doubles when LOW test signal level 20mVrms is used Note l Table B 3 is applicable under the following conditions 1 Test Frequency 1MHz 2 CABLE LENGTH Im 3 Test Signal Level HIGH 1Vrms 4 Sample s D Value lt 0 1 5 Test Lead Model 16048A and 16048B 6 Zero offset adjustment has been performed with the OPEN and SHORT terminations of the Model 16074A Note 2 Error doubles when LOW test signal level 20mVrms is used SECTION I Model 4277A Table 1 1 Specifications Sheet 11 of 17 L Q Measurement Accuracy L Accuracy L accuracy of L D measurement Q Accuracy D accuracy measured D value x 100 of Q reading 1 count Note Q value is the reciprocal of D Note Q aceuracy is calculated from the measured D value Refer to Figure 3 19 HIGH SPEED L Measurement Accuracy L Aceuracy L accu
61. 500Hz steps 100kHz to 200kHz in 1kHz steps 200kHz to 500kHz in 2kHz steps 500kHz to LMHz in 5kHz steps Note When the DISPLAY A Function is set to HIGH SPEED L or HIGH SPEED C or when the EREQUENCY DC BIAS Select Key is set to DC BIAS mode this key is disabled and the SPOT COARSE and FINE indicators are turned off Figure 3 1 0 0 FREQUENCY DC BIAS Step Control Keys These keys and are used in conjunetion with the FREQUENCY DC BIAS Select Key 9 and the SPOT COARSE FINE Select Key 0 to set the test frequency and DC bias voltage Option 001 instruments only When FREQUENCY mode is selected by the FREQUENCY DC BIAS Select Key 9 test frequency is increased in accordance with the selected vernier mode SPOT COARSE FINE each time the is pressed and is decreased each time the key is pressed These keys control DC bias in a similar manner when DC BIAS mode is Selected b the FREQUENCY DC BIAS Select Key When either of these keys is pressed and held the value displayed on the FREQUENCY DC BIAS Display will continuously change in the indicated direction The actual value however will not change until the key is released Front Panel Features Sheet 3 of 6 Model 4277A TRIGGER Keys These keys select the trigger mode for triggering measurement Internal or Manual External INT Internal trigger signal enables instrument to make repeated automatic measure ments MAN E
62. 60 PRINT TRG TOU FAST SRG TEST PASS 370 5 0 380 DISP OPERATIONAL ERRAR SRO TEST 396 GUTPUT MI N1N2 400 G SUB 480 410 PRINT OPERATIONAL ERROR SRO TEST PASS 420 PRINT SRG TEST END 430 CLERR M 446 RBORTIO M 450 LOCAL M 460 DISP END 470 END 480 ENABLE INTR 8 430 IF 50 THEM DISF S RETURN 300 GOTI 480 110 OUTPUT MI F1T2DR BZD TRIGGER MI 30 ENTER MI A B 40 IF S Q THEM 510 350 RETURN 250 S SPOLL Mt STATUS 7 1 3 Z 370 IF BIT S 6 1 THEN 530 380 DISP OTHER DEVICE ZRO 330 ENABLE INTR 738 500 RETURN 4 30 Model 4277A PERFORMANCE TESTS SECTION IV Table 4 14 Controller Instruetions and Operator Responses for Test Program 3 Controller Instructions Displays Printout x 4277A HP IB TEST No 3 x SRQ TEST SRQ TEST DATA READY SRQ TEST 65 SYNTAX ERROR SRQ TEST 66 SYNTAX ERROR SRQ TEST SELF TEST END SRQ TEST SELF TEST in progress 68 TRIGGER TOO FAST SRQ TEST MOMENTARILY GROUND EXT TRG CONNECTOR 72 OPERATIONAL ERROR SRQ TEST 80 2 OPERATIONAL ERROR SRQ TSR TEST END SRQ Status Byte data may be 73 01001001 due to EXT TRG pin to ground SRQ Status Byte data may be 81 01010001 due to the EXT TRG pin to ground DATA READY SRQ TEST PASS SELF TEST END SRQ TEST PASS TEST PASS Operator Response SRQ Status Byte data should be 65 01000001 SRQ Status Byte data should be 66 PASS i 01000010 SRQ Status Byte
63. 7 BIOEN The above remote programming examples can be used on the HP Model 85 with 00085 15003 I O ROM Model 9835A Model 9845B C Model 9826A and Model 98364 13 Wait until the de bias voltage returns to 0V Example of programming a 10ms wait Note WAIT 10 In the above examples HP IB address 17 was used Figure 3 31 Option 001 Internal DC Bias Sheet 3 of 3 3 73 SECTION HI INTERNAL DC BIAS VOLTAGE MONITOR The internal de bias voltage is monitored by a DVM or an oseilloseope at the EXT INPUT INT MONITOR connector on the rear panel Note The de bias voltage monitored at the EXT INPUT INT MONITOR connector may contain a small ae component When the DUT impedance is higher than 100k the monitored voltage is equal to the de voltage source voltage and to the voltage applied to the DUT These voltages however are different when the DUT impedance is less than 100k The following paragraph deseribes how to measure the aetual bias voltage across the DUT 1 Ri R2 R Deteetion a Set the TEST SIG LEVEL to LOW b Set the LCIZ range so that the range resistor value will be 1000 Refer to Figure 3 5 c Set the DC BIAS voltage to 5V on the FREQUENCY DC BIAS display d Connect nothing to the test fixture e f g h i Model 4277A OvVo or VK VH DUT OPEN OOR or DUT 100 VL Set the DC BIAS switch on the front panel to ON Me
64. 89 LR L X5 of rdg i myj i 0 C 55 C 2 of rdg 20mV GERE i fit rdg 35mV 40 0 m 100mv i Adeki rds gt E t 2 amp of rdg 70mV 00 9 99V omy Output Impedance 1040521036 Bias Voltage Monitor Bias voltage across the DUT ean be monitored at the EXT INPUT INT MONITOR BNC connector on the rear panel INT MONITOR output impedance is approximately 7308 Output Characteristies Measurement accuracies are guaranteed when output current is maximum Option 002 COMPARATOR HANDLER INTERFACE Contents Model 16064A COMPARATOR HANDLER INTERFACE Ineludes the 16064 66502 Interface board assembly and 1251 0084 36 pin male Amphenol eonneetor 1 20 Comparator Funetion Compares measured values to 9 sets Bins of stored high low limits Displays LOW IN HIGH judgements and bin number Handler Interface Function Outputs comparison results and handler control signals open eolleetors TTL Detects KEY LOCK and EXT TRIGGER signals sent from component handler Option 907 Front handle kit Part No 5061 0090 Option 908 Rack flange kit Part No 5061 0078 Option 909 Rack flange and handle kit Part No 5061 0084 Option 910 Extra manual Accessories Supplied Test Fixture 16047A Test Fixture Includes three kinds of eontaet inserts Power Cord HP Part No 8120 1378 Fuse Part No 2110 0007 100V 120V Part No 2110 0360 220V 240V Protective Fuse Part
65. 8mS 0 008mS IMHz C 0 0005nF 0 0005nF G 0 007mS 0 007mS Test Singal Level LOW Frequency 10kHz C 0 0016nF 0 0016nF G 0 14uS 0 14uS 20kHz C 0 012nF 0 012nF G 0 22uS 0 22uS 20 2kHz C 0 012nF 0 012nF G 0 0016mS 0 0016mS 50 5KHz C 0 011nF 0 011nF G 0 0016mS 0 0016mS 100kHz C 0 0016nF 0 0016nF G 0 0014mS 0 0014mS 200kHz E 0 012nF 0 012nF G 0 0022mS 0 0022mS 202kHz C 0 012nF 0 012nF G 0 016mS 0 016mS 505kHz C 0 011nF 0 011nF G 0 016mS 0 016mS 1MHz C 0 0010nF 0 0010nF G 0 014mS 0 014mS SHORT Test Signal Level HIGH Frequency 10kHz L 0 0009mH 0 0009mH ESR 0 052 0 052 20kHz L 0 6UH 0 6uH ESR 0 089 0 082 iv Model 4277A SECTION IV PERFORMANCE TEST RECORD Paragraph Number TEST BEEN Massa 15 OPEN SHORT TEST Cont d 20 2kHz 0 15uH 0 089 0 13uH 0 088 50 5kHz L 0 11uH 0 11uH ESR 0 0882 0 082 100kHz 0 09uH 0 059 0 09uH 0 058 200kHz L 0 06uH 0 06uH 0 08 0 088 202kHz L 0 015uH 0 015uH 0 088 0 088 505kHz 0 011uH 0 08Q 0 011uH 0 088 IMHz L 0 009uH 0 009uH 0 058 0 0540 Test Signal Level Frequency iO0kHz 0 0018mH 0 108 0 0018mH 108 20kHz L 1 2uH 1 2uH ESF 0 162 162 20 2kHz L 1 2uH 1 2uH ESR 0 169 0 168 50 5kHz L 1 1uH l lyuH ESR 0 168 0 1682 100kHz L 0 18uH 0 18uH ESR 0 10Q 0 100 200
66. A and 16384A and 16074A Standard Resistor Set The characteristics of the equipment satisfy the performance requirements for the accuracy checks and are especially suited for use as the 4277A s aecuraey test standards Note Components used as standards should be calibrated by an instrument whose specifications are traceable to NBS or an equivalent standards group or calibrated direetly by an authorized calibration organization such as NBS The ealibration eyele should be in accordance with the stability specifications for each component 4 5 TEST RECORD 4 6 Performance test results can be recorded on the Test Record at the completion of the test The Test Reeord is at the end of this section and it lists all the tested specifications and their acceptable limits Test results recorded at incoming inspection can be used for comparison in periodic maintenance trouble shooting and after repair or adjustment 4 7 CALIBRATION CYCLE 4 8 This instrument requires periodic verification of performance Depending on the eonditions under which the instrument is used e g environmental conditions or frequency of use the instrument should be checked with the performance tests described here at least once a year To keep instrument down time to a minimum and to insure optimum operation preventive maintenance should be performed at least twice a year 4 1 SECTION IV ACCURACY TEST CONSIDERATIONS 4 2 This paragraph dis
67. B LISTEN 1 TALK 0 REMOTE Status Indicators LISTEN 1 TALK 0 REMOTE 1 and Controller Display are the same press vl and END LINE if not press N and END LINE If all steps are correct this message is output REMOTE LOCAL TEST PASS REMOTE LOCAL TEST PASS REMOTE LOCAL TEST FAIL REMOTE LOCAL TEST FAIL If any step fails this message is output LISTEN 0 TALK 1 REMOTE 1 If the 4277A HP IB LISTEN 1 TALK 0 REMOTE 1 Status Indicators and Controller Display are the same press Y and END LINE Tf not press N and END LINE If both steps are correct this message is output LISTEN TALK TEST PASS LISTEN TALK TEST PASS LISTEN TALK TEST FAIL LISTEN TALK TEST FAIL 1f any step fails this message is output indicates ON 0 indicates OFF 4 21 SECTION IV Mode 4277A PERFORMANCE TESTS O a ANN TEST PROGRAM 2 PURPOSE This test verifies that the 4277A has the following HP IB capabilities 1 Talker 2 Device Trigger PROGRAM LISTING 10 4277A HP IB TEST No 7 20 TALKER TEST 30 DIM R 11001 B C11 0 Me Mf 717 50 S SPOLLCM1 BO PRINT xx 4277A HP IB TEST No 2 sxs 70 CLEAR 80 DISP TALKER TEST 30 DISP CONNECT 100pF 100 BEEP 110 PRUSE DISP DATA UUTPUT TEST REMDTE M O RBORTIO M CLEAR MI OUTPUT MI AZBIF1TZ DISP TEST FREQUENCY IN kHz INPUT F GUTPUT MI FR F EN 200 TRIGGER
68. Capacitance LOpF TEST SIG LEVEL HIGH TEST SIG LEVEL LOW C Test Limits C Test Limits D Test Limits Test Frequency 20 2kHz C V 50 052pF 050 009 C V 2 1pF 50 5kHz C V 0 046pF C V 2 1pF 100kHz C V 0 043pF C V 0 27pF 200kHz C V 0 048pF C V 2 1pF 202kHz C V 0 027pF C V 0 14pF 505kHz C V 0 021pF C V 0 13pF IMHz C V 0 015pF C V 0 020pF C V Calibrated Value of Standard Capacitor Table 4 7 a Capacitance Accuracy Tests CABLE LENGTH 0 continued Standard Capacitance 100pF Test TEST SIG LEVEL HIGH TEST SIG LEVEL LOW Frequency C Test Limits D Test Limits C Test Limits D Test Limits 10kHz 20kHz 20 2kHz 50 5kHz 100kHz 200kHz 202kHz 505kHz 1MHz 3 C30 1 2 C101 00 03 C 2 C1 00 C C ez eL oL o oL oL oc o o C V Calibrated Value of Standard Capacitor 4 15 SECTION IV Model 4277A PERFORMANCE TESTS Table 4 7 a Capacitance Accuracy Tests CABLE LENGTH 0 continued Standard Capacitance 1000pF Test TE i T 7 ps9 E 2d Praqueney TEST SIG LEVEL HIGH TEST SIG LEVEL LOW Limits D Test Limits 0 0036nF 014nF 014nF Ol 3nF 0 0036nF O14nF O14nF 013nF 0020nF 2 Test Limi L Limits V 0 0018nF 0 0023nF 10kHz V V 0 0027nF V 20kHz 20 2kHz 50 5kHz 100kHz 200kHz 202kHz V 0 0027nF 505kHz C Vt 0 0021nF iMHz C V x0 0015nF V 0 0021nF V 0 0018nF V 0 0023nF
69. ED C o 3 15 DISPLAYS 3 16 The 4277A has three front panel displays DISPLAY A DISPLAY B and FREQUENCY DC BIAS Each is deseribed in paragraphs 3 17 through 3 19 respectively 3 17 DISPLAY A provides direct readout of measured C L or Z with 4 1 2 digit display resolution The actual number of display digits depends on measurement range test frequency and test signal level The least CA digit may be displayed as a small zero or may be blank J to indicate that the digit does not provide a specified value Maximum number of counts is 19999 DISPLAY A also displays error codes operational annuneiations and the HP IB address or output data format 3 18 DISPLAY B provides direct readout of measured D Q ESR G or 6 with 4 1 2 digit display resolution The actual number of display digits depends on measurement range test frequency test signal level and number of DISPLAY A counts The least significant digit may be displayed as a small zero or may be blank Fl to indicate that the digit does not provide a specified value Maximum number of display counts depends on the DISPLAY B function Refer to Table 3 2 DISPLAY B also displays error codes operational annunciations and option annunciation 16064 when the instrument is equipped with Option 002 When the DISPLAY A funetion is HIGH SPEED C or HIGH SPEED L DISPLAY B is blank Model 4277A Note Option annunciation 16064 appears only when the 16064A
70. H this button is pressed when the test fixture or test leads are shorted measured values at this time are stored as residual impedance data SECTION III CABLE LENGTH Switch This switch facilitates balancing of the measuring bridge cireuit and minimizes measurement errors when the standard 1 meter test leads are used 1m Set the switch to this position when using the standard meter test leads Appropriate compensation is made for propagation delay and phase error caused by the test leads in high frequeney measurements 0 Set the switch to this position when using a direct attachment type test fixture such as the 16047A connects to the UNKNOWN terminals 2 Note This switch is not HP IB programmable UNKNOWN Terminals These four BNC connectors provide the means to conneet DUT s in a four terminal pair configuration High eurrent terminal Han High potential terminal Heo Low potential terminal Lpor and Low current terminal Lco Four terminal pair test fixtures attach directly to these terminals GUARD Terminal This terminal is tied to the instrument s chassis and ean be used in measurements that require guarding Figure 3 1 Front Panel Features Sheet 6 of 6 SECTION II D EXT DC BIAS FUSE Holder External DC bias fuse is installed in this holder The fuse must be installed when an external bias source is used Fuse rating is 1 16A 250V HP P N 2110 0011 DC BIAS
71. HP IB To change a front panel control setting on the 4277A first disable turn off the 16064A Press the COMPARATOR ENABLE key the lamp at the center of the key should go off Illegal COMPARATOR operation One of the 16064A s keys except the COMPARATOR ENABLE key was pressed or was set via HP IB while the 16064A was disabled To operate the COMPARATOR first enable turn on the 16064A Press the COMPARATOR ENABLE key the lamp at the center of the key should come on Model 4277A SECTION IH Table 3 6 Operation Error Codes Displayed on DISPLAY A B Sheet 3 of 3 DISPLAY A ZO OUI UMEN EIESMS OIS PLAY D Eg z g H mH Y ooo DISPLAY A Dien DISPLAY S pra G E o BF oW a m c Illegal COMPARATOR operation The 4277A s front panel control settings are different from those that existed when the present bin limits were entered Illegal COMPARATOR operation The RUN key on the 16064A was pressed or was set via HP IB when no bin limits were entered or a bin s LOW LIMIT is higher than its HIGH LIMIT Iilegal parameter setting The test frequency setting internal dc bias setting or a bin limit setting is out side the specified limits Iliegal HP IB address The HP IB address switches on the rear panel were set to 31 11111 when the instrument was turned on Illegal deviation measure ment operation The A key on the front panel was pres
72. I HPOT VECTOR VOLTMETER Model 4277A VECTOR AMMETER Detects vector current flow through DUT Detects vector voltage across DUT Figure 3 9 Four Terminal Pair Measurement Principle 3 47 MEASUREMENT OF SAMPLES GROUNDED 3 48 Samples which have one terminal except GROUND terminal grounded to earth cannot normally be measured by the 4277A Such measurement conditions are for example the distributed capacitance measurement of a coaxial cable with a grounded shield conductor or the input output impedance measurement of a Single ended amplifier When a one side grounded sample is eonnected for measurement the 4277A may display a measurement error message or incorrect measurement results This is beeause the bridge section cannot achieve a balance with any measurement terminal grounded and additionally any grounding modifies the four terminal pair measurement architecture other than an internal connection of the shield eonductor to instrument chassis at one point Note If one terminal is grounded a signal current of equal magnitude an operating condition of the four terminal pair configuration measurement will not flow in the inner and outer conduetors of the measurement cable 3 38 3 49 SELECTION OF TEST CABLE LENGTH 3 50 The propagation signal in a transmission line will develop a change in phase between two points on the line as illustrated in Figure 3 10 The difference in phase corre
73. II PO BINARY PI Mode Note indicates an initial control setting Refer to paragraph 3 38 Displays A B Comparator Display A or Comparator 3 57 SECTION III 3 94 DATA OUTPUT 3 95 Measurement and status data are output to external devices in bit parallel byte serial format via the eight DIO signal lines of the HP IB Data can be output in ASCII mode or PACKED BINARY mode Each mode is described below 1 ASCH mode Output data in this mode includes status data key status function data and measurement data including range for DISPLAY A and DISPLAY B If the instrument is equipped with Option 002 comparison data LOW IN HIGH for L C Z and D Q ESR G and BIN number data ean be output too The output format is shown in Figure 3 25 All characters are coded in accordance with ASCII coding conventions 2 PACKED BINARY mode Output data in this mode is output as one or two binary bytes rather than as a character representation This data output format is for high speed data transfer Contents of output data however is less than that of ASCH mode Output data in this mode includes status data for DISPLAY A and DISPLAY B measurement range data as an 8 bit byte and measurement data of DISPLAY A and DISPLAY B not ineluding unit and decimal point as a 16 bit 2 s complement binary word If the instrument is equipped with Option 002 comparison data LOW IN HIGH for L C Z and D Q ESR G
74. LA Packano 260141 OPERATION AND SERVICE MANUAL MODEL 4277A LCZ METER Including Options 001 and 002 SERIAL NUMBERS This manual applies directly to instruments with serial numbers prefixed 2228J Q COPYRIGHT YOKOGAWA HEWLETT PACKARD LTD 1982 9 1 TAKAKURA CHO HACHIOJI SHI TOKYO JAPAN MANUAL PART NO 04277 90000 Microfiche Part No 04277 90080 ai SWW Printed JAN 1984 MANUAL CHANGES 260141 MANUAL IDENTIFICATION 427TA Model Number 4277A Date Printed JAN 1984 LCZ METER Part Number 04277 90000 This supplement contains important information for correcting manual errors and for adapting the manual to instruments containing improvements made after the printing of the manual To use this supplement Make all ERRATA corrections Make all appropriate serial number related changes indicated in the tables below SERIAL PREFIX OR NUMBER MAKE MANUAL CHANGES SERIAL PREFIX OR NUMBER MAKE MANUAL CHANGES 2517301271 and above 2228901030 and above 2515J01618 and above NEW ITEM ERRATA Page 3 49 Figure 3 22 External Trigger Pulse Change the Input Level limits to read as follows Input Levels Vu 0 4V 2 4V 5 Vy Z 5V Page 3 74 Figure 3 32 Internal DC Bias Voltage Monitor Sheet 1 of 2 In item 1 i change the equation for R to read as follows R Vx VH Ro Vx Vt Page 4 A Table 4 1 Recommended Equipment Sheet 1 of 2 Change the Recommended Mod
75. LOW and HIGH limits are inelusive that is if the measured value is exactly equal to the LOW or HIGH limit of a bin the measured value fits the limits for that bin Also if a measured value fits the limits of more than one bin bin limits overlap the comparator selects the bin with the lower number An example follows Bin 1 100pF to 200pF Bin 2 150pF to 250pF Measured Value 190pF Selected Bin Bin 1l Note If the LOW HIGH limits for D Q ESR G are not entered or when the instrument is set to HIGH SPEED L or HIGH SPEED C the IN lamp for D Q ESR G wil be always lit D Q ESR G comparison is not performed however Figure 3 34 Option 002 Comparator Sheet 1 of 7 3777 SECTION IH 3 78 Table A Limits for L C Z LOW Limit HIGH Limit Cs enun oe Table B Limits for D Q ESR G LOW Limit HIGH Limit Table C Measured Values Measured Measured Data 1 le DATE 1 22 n F 1 08 nF Model 4277A Table D Comparison Results Sample L C z D Q ESR FREQUENCY Lamp G Lamp DC BIAS LOW INHIGHILOW IN HIGH Display e d z zz x Ex mm L 1 e Q e brad H Li LJ 0 5 Figure 3 34 Option 002 Comparator Sheet 2 of 7 L C 1Z Model 4277A COMPARATOR LIMIT SETTING L C IZI LOW IN HIGH O O O praresrra Low WN NIGH 00 O l Press the ENABLE key 1 The LED lamp 8 at the center of the key should come on
76. M 210 ENTER M1 A B 220 DISP Hx1 E12 pF B 230 DISP IE OUTPUT DATA CORRECT iY or N 240 INPUT BS 250 IF B H THEN Z60 ELSE 290 260 PRINT DATA GUTPUT TEST FRIL 7G DISP PATA OUTPUT TEST FAIL 86 GOTO 319 380 PRINT DATA OUTPUT TEST PASS 6 DISP DATA OUTPUT TEST PRSS O DISP COMPLETE DRTR OUTPUT TEST 320 TRIGGER MI 330 ENTER MI R 340 DISP R 350 DISP IS OUTPUT DRTA CORRECT Y or MI 360 INPUT B 370 IF B N THEN 380 ELSE 410 380 PRINT COMPLETE DATA OUTPUT TEST FAIL 380 DISP COMPLETE DATA OUTPUT TEST FAIL 400 GUTO 430 410 PRINT COMLPETE DATA OUTPUT TEST PASS 420 DISP COMPLETE DRTR OUTPUT TEST PASS 430 PRINT END 440 DISP END 450 CLEAR M 460 LOCAL M 470 END gt C r KD Er E OS LH fa os fa Goc 4 28 Model 4277A PERFORMANCE TESTS Table 4 13 Controller Instruetions and Operator Responses for Test Program 2 Tc ers epo I CONNECT 100pF Connect the 16383A 100pF Standard to the UNKNOWN terminals Key in desired test frequency value from 10 to 1000 and press ERG LINE If the output data is the same as the values displayed on each 4277A display press and END LINE If not press N and END LINE DEER OUTPUT TES E PADS DATA OUTPUT TEST result DATA OUTPUT TEST FAIL COMPLETE DATA OUTPUT TEST n If the output data s the same as the left values press IC and END LINE If not press f and END LINE PNC Capacitance
77. ND Dissipation Factor IS OUTPUT DATA CORRECT Y or N COMPLETE DATA OUTPUT TEST PASS COMPLETE DATA OUTPUT COMPLETE DATA OUTPUT TEST FAIL TEST result OI es ee Operator Responses DATA OUTPUT TEST TEST PREQUENCY IN kHz Capacitance Dissipation Factor IS OUTPUT DATA CORRECT Y or N SECTION IV 4 29 SECTION IV Model 4277A PERFORMANCE TESTS RRR EEE ES RS SS I EEEE z CSS TEST PROGRAM 3 PURPOSE This test program verifies that the 4277A has the following HP IB capabilities 1 Service Request 2 Serial Poll PROGRAM LISTING 10 i 42770 HF IB TEST No 3 ZU P SEG TEST 30 SG Ms A Mi 717 40 ON INTR 7 SOSUB 560 20 CLEAR O PRINT xs 4277R HP IE TEST No 3 xxx TO PRINT SRO TEST HO DISP SRO TEST SO REMOTE M 190 ABURTIG M 110 CLEAR MI 120 DISP DATA READY SRA TEST 130 OUTPUT M DiT2 140 TRIGGER MI 130 GOSUB 480 150 PRINT DATR REAL SRU TEST PASS 176 Gea 190 DISP SYNTRAX ERROR SRG TEST 190 OUTPUT M DORSDR TOV GOSUB 480 210 PRINT SYNTAX ERROR ZRO TEST PASS ezO0 SQ 220 DISP SELF TEST END SRG TEST 240 DUTPUT M1 1 250 DISP SELF TEST in progress S60 GOSUB 480 70 IF BIT OS5 2 050 THEN GOSUB 480 OUTPUT Mi SO 280 PRINT SELF TEST END SEQ TEST PASS 300 Sed 210 DISP TRIGGER TUS FAST SRO TEST 320 DISP MOMENTARILY GROUND 330 DISP EXT TRG CONNECTOR 340 GOSUB 510 350 GOSUB 480 3
78. Number of Display Digits Sheet 8 of 16 Model 4277A SECTION HI NUMBER OF DISPLAY DIGITS FOR DISSIPATION FACTOR IN L D MEASUREMENT See Figure J 4 802 33 2 Numbers not enclosed in parentheses apply when Test Signal Level is HIGH numbers enelosed in parentheses apply when Test Signal Level is LOW Shaded areas indicate that measurement cannot be performed When the measured L value is less than 5 6 of full seale D measurement eannot be performed MED SLOW FAST at l0k 100k 1MHz at 10k 100k IMHz Full Scale Factor Full Scale Factor Figure H Figure I Figure H Figure I Note Numbers not enelosed in parentheses apply when Test Signal Level is HIGH numbers enclosed in parentheses apply when Test Signal Level is LOW Figure 3 4 Measurement Ranges and Number of Display Digits Sheet 9 of 16 3 25 SECTION IH Model 4277 A EMEN d p L EEEE z Full Scale Factor Fuli Scale Factor Hi aa mms Ai 100k Test Frequency Hz Test Frequency Hz Figure Hz 4 3 Full Scale Factor Full Scale Factor 100k Test Frequency Hz Test Frequency Hz Figure Io Numbers not enclosed in parentheses apply when Test Signal Level is HIGH
79. OLTAGE EXCEEDS 40V THE UNKNOWN terminals of the 4277A INSTRUMENT MAY BE DAMAGED Turn on the instruments Note Set the 4277A s controls as deseribed in DC bias current flowing through sample steps 5 through 7 of Figure 3 20 Set the can be calculated by the following DISPLAY A funetion to L measurement equation mode I _ E bias 6 Perform OPEN and SHORT Zero Offset bh tea UR Adjustments Figure 3 23 External DC Bias Sheet 3 of 4 Model 4277A where E bias is the bias voltage V applied to EXT INPUT INT MONITOR connector and Rx is the de resistance kN of the sample 9 Read the measured values 10 Gradually decrease the de voltage source output voltage until the de bias eurrent is OmA then remove the sample from the test fixture or test leads Note To make stable measurements connect an ae bypass capacitor near lF between the positive terminal and the negative terminal of the de voltage source SECTION Il Note Maximum allowable current depends on the bridge circuit s range resistor as listed in the table below Range Resistor Maximum Output Current 1002 Refer to Figure 3 5 for details on the relation between range resistor and measurement range Note that measurement aceuracies as specified in Seetion I are not guaranteed if bias eurrent is allowed to exeeed the limits given in the above table Figure 3 23 External DC Bias Sheet 4 of 4
80. PERFORMANCE TESTS 4 1 INTRODUCTION 4 2 This section provides the tests and the procedures used to verify the 4277A specifications listed in Table 1 1 All tests ean be performed without aceess to the interior of the instrument A simpler operational test is presented in Section II under Self Test The performance tests can be used when performing incoming inspeetion of the instrument and when verifying that the instrument meets performance specifications after troubleshooting or adjust ment or both If the performance tests indicate that the instrument is operating outside specified limits check to see if the controls on the instrument used in the test and the test setup itself are correct and then proceed with adjustments or troubleshooting or both Note To ensure proper test results and instrument operation Hewlett Packard recommends a 30 minute warm up and Stabilization period before performing any of the performance tests Note All performance tests except for the HP IB Interface Test should be performed in an ambient temperature range of 23 C 5 C 4 3 EQUIPMENT REQUIRED 4 4 Equipment required to perform all of the performance tests is listed in Table 4 1 Any equipment that satisfies or exceeds the critical specifications listed in the table may be used as a substitute for the reeommended models Accuracy cheeks described in this section use the HP 16380A series standard capacitors 16381A 16382A 16383
81. Q ESR See Note 1 G 1 50anS 60nS 5 ESR 108 G 15 ESR See Note 1 G 1 SauS 6US 5 ESR See Note l G 3 5auS SUS 5 mn ui poj pu ee 1 500mQ 30m 5 G See Note 2 ESR 3 Som 6mQ 5 G See Note 2 SECTION I Model 4277A Table 1 1 Specifications Sheet 13 of 17 Equations in Tables B 4 and B 5 represent ESR accuracy is 2 L aceuracy measured L x 100 of ESR reading ESR A A G accuracy measured G x 100 of A ESR reading 1 count G Accuracy i G accuracy is 2 L aceuracy measured L x 100 of G reading Full seale factor measured L value ESR aceuracy measured ESR x full seale L value For example 100 of G reading 1 count when measured C value is 850nH on the 1000nH range ais 0 85 Note 3 Tables B 4 and B 5 are applicable under the following conditions 1 CABLE LENGTH lm 2 Test Signal Level HIGH i Vrms 3 Sample s D Value lt 0 1 4 Zero offset adjustment has been performed with the OPEN and SHORT terminations of the Model 160744 Note 4 Error doubles when LOW test signal level 20mVrms is used Table B 6 Additional Measurement Error for Note 1 Table B 6 is applicable under the ESR and G at 1MHz followig conditions CH WERE m 1 Test Frequency 1MHz CABLE LENGTH Im Test Signal Level HIGH 1Vrms Sample s D Value lt 0 1 Test Lead Model 16
82. SI MC1 1 Interface Capabilities SH1 AKI T5 L4 SR1 RLI DCI DTI and El Remote Control All front panel control settings except power switeh DC BIAS ON OFF switeh and CABLE LENGTH switch and all 16064A Comparator Handler Interface settings option 002 Data Output Parameter measured Equivalent circuit mode Display status Measured values Comparator output Output Format ASCII format or Binary format Continuous Memory Memorizes all front panel control settings except DC BIAS voltage setting zero offset adjustment data A reference values and comparator limits option 002 when the instrument is turned off or experiences a power failure Settings and data are recalled when the instrument is turned on Warm up Time Minimum 30 minutes Ambient Temperature 239 C 5 C at 0 C to 55 C error doubles General Specifications Operating Temperature 0 C to 55 C Relative Humidity 95 at 40 C Storage Temperature 40 C to 70 C Power Requirements 90V to 132V 198V to 250V 48Hz to 66Hz Power Consumption 75VA max with any option Dimensions 425 5 W x 188 H x 430 D mm Weight Approximately 8 5kg SECTION I Model 4277A Table 1 1 Specifications Sheet 3 of 17 Capacitance Measurement Accuracy C D Measurement Accuracy C Accuracy t of reading error in farads number of counts see Tables A l and A 2 D Aeeuraey of reading D error number o
83. Signal Level HIGH 1Vrms or LOW 20mVrsm Level Accuracy Test Frequency Test Signal Level 10kHz to 995kHz Output Impedance 1002 10 Deviation Measurement Caleulates and displays the difference between a stored reference values and measured values Self Test Checks the 4277A s basie operation when the instrument is turned on or when the SELF TEST key is pressed If an abnormality is detected an error code is displayed on DISPLAY A Model 4277A SECTION I Table 1 1 Specifications Sheet 2 of 17 Zero Offset Adjustment Compensation for residual impedance and stray admittance of the test fixture connected to the UNKNOWN terminals is automatieally done by the ZERO OPEN SHORT buttons Compensation frequencies 10k 20 2k 50 5k 100k 202k 505k 700k 900k and 1MHz Compensation at other frequencies is automatically done by secondary interpolation Maximum Offset Values C Up to 20pF open G Up to 215 L up to 2uH R up to 20 short CABLE LENGTH Im or Om Use Om for direct attachment type test fixtures use 1m for test leads Trigger Internal External Manual or HP IB remote eontrol External DC Bias Up to 40V de ean be applied to the DUT from an external voltage souree eonneeted to the EXT INT INT MONITOR BNC connector on the rear panel Output impedanee is 10402410 HP IB Hewlett Packard Interface Bus Data output and remote control Based on IEEE Std 488 and AN
84. T 717 ELER 6 Enter the LOW HIGH limits for L C Z via the HP IB Example of setting a low limit of 950nF and a high limit 1 InF OUTPUT 717 LL ISENLHI LEN If necessary enter the limits for the next bin Bin 2 Figure 3 34 Option 002 Comparator Sheet 4 of 7 Model 4277A Example of setting bin 2 s low limit to 1 1001nF and high limit to 1 2nF OUTPUT 717 N2 OUTPUT 717 LLI 100IENLHI 2EN Note The same setting can be made by the following program OUTPUT 717 N2 OUTPUT 717 LEL 2EN 7 Enter the limits for D Q ESR G via the HP IB Example of setting a low limit of 0000 and a high limit of 005 OUTPUT 717 L2 OUTPUT 717 LLOENLH 005EN Note The same setting can be made by the following program OUTPUT 717 L2 OUTPUT 717 LH 005EN Note Comparator operations ean be done without high low limits for D Q ESR G 8 Start the comparator operation by HP IB program Example of starting the comparator operation OUTPUT 717 G1 9 Conneet the DUT to the test fixture SECTION IH 10 Trigger the instrument via the HP IB Example of triggering the instrument OUTPUT 717 EX TRIGGER 717 If necessary read the comparison results via the HP IB ENTER 717 A PRINT A Note The HP IB address eode in the above examples is 17 10001 Figure 3 34 Option 002 Comparator Sheet 5 of 7 SECTION HI OPTION 002 HANDLER INTERFACE OPERATION
85. TRIGGER i rS eh Model 4277A SECTION IV 5 Set the 3478A s controls as follows PUCUTION Aidata odd DCV RANGE Pete nee 9 49 4 2 09923249 942 95546 ototsotbobBtTtt9tth 65645243 300V Display eceane 4YORRORODORREDOR E 6 69 49 659 4994849204004q8 t v 46945 9069 6290 3 1 2 digits 6 Conneet the 3478A s LO input to the 4277 A s GUARD terminal T Press the 16064A s ERASE key and set the following comparator limits L C Z LOW LIMIT BIND 3 L C Z HIGH LIMIT BIN 9 D Q ESR G LOW LIMIT 2 D Q ESR G HIGH LIMIT 8 8 Connect the 100k2 standard resistor to the 4277A s UNKNOWN terminals 9 Press the RUN key on the 16064A s control panel 10 Verify that the L C Z LOW and D Q ESR G HIGH lamps light and 0 is displayed on the 4277A s FREQUENCY DC BIAS DISPLAY i C M FREQUENCY DC BIAS LOW IN HiGH o o D Q ESR G Mid iow iN HIGH BIN NUMBER oo ll Cheek the states of the comparison data output TTL at the HANDLER INTERFACE connector using the 3478A The pin assignments and the data states are shown in Figure 4 8 and Table 4 11 12 Disconnect the 100kQ resistor and connect a 1000pF standard capacitor 13 Verify that the L C Z HIGH and D Q ESR G LOW lamps light and 0 is displayed on the 4277A s FREQUENCY DC BIAS DISPLAY yeni LOW IN HIGH oo 8 D Q ESR G Low Dc CHR i GIN NUMBER c 11 eee er aad 4 23 SECTION IV Mode
86. UTION USE PROPER FUSE FOR LINE VOLTAGE SELECTED CAUTION MAKE SURE THAT ONLY FUSES FOR THE REQUIRED RATED CURRENT AND OF THE SPECIFIED TYPE ARE USED FOR REPLACEMENT THE USE OF MENDED FUSES AND TRE SHORT CIRCUITING OF FUSE HOLDERS MUST BE AVOIDED 2 10 POWER CABLE 2 11 To protect operating personnel the National Electrical Manufacturer s Association NEMA recommends that the instrument panel and cabinet be grounded The Model 4277A is equipped with a three conductor power cable which when plugged into an appropriate receptacle grounds the instrument The offset pin on the power cable is the ground wire 2 1 SECTION H 2 12 To preserve the protection feature when operating the instrument from a two contact outlet use a three prong to two prong adapter HP Part No 1251 8196 and connect the green pigtail on the adapter to power line ground CAUTION THE MAINS PLUG MUST ONLY BE INSERTED IN A SOCKET OUTLET PROVIDED WITH A PROTECTIVE EARTH CONTACT THE PROTECTIVE ACTION MUST NOT BE NEGATED BY THE USE OF AN EXTENSION CORD POWER CABLE WITHOUT PROTECTIVE CONDUCTOR GROUNDING 2 13 Figure 2 2 shows the available power eords which may be used in various countries including the standard power cord furnished with the instrument HP Part number applicable standards for power plug power cord color electrical characteristics and countries using each power cord are listed in the figure If assistance is needed
87. V 0 014nF D 1 0 11 G V 0 014nF 0 11 505kHz C C V 0 013nF C V 0 013nF D 0 013 0 013 1MHz V 0 0020nF C V 0 0020nF D 0 0032 0 0032 C V Calibrated Value ix SECTION IV Model 4277A PERFORMANCE TEST RECORD 4 17 CAPACITANCE ACCURACY TEST Cont d CABLE LENGTH lm lpF Range Test Signal Level i HIGH C C V 0 0083pF V 0 0083pF D 0 0050 0 0050 LOW t C V 0 035pF C V 0 035pF D 0 019 0 019 lOpF Range HIGH E C V 0 020pF C V 0 020pF D 0 0019 0 0019 LOW e C V 0 030pF C V 0 030pF D 0 0038 0 0038 100pF Range HIGH C C V 0 18pF C V 0 18pF D 0 0018 0 0018 LOW C C V 0 26pF C V 0 26pF p 0 0036 0 0036 1000pF Range HIGH C C V 0 0021nF C V 0 0021nF D 0 0019 0 0019 LOW C C V 0 0032nF C V 0 0032nF D 0 0038 0 0038 4 19 RESISTANCE ACCURACY TEST 1008 Range Frequency Test Signal Level 10kHz HIGH LOW 20kHz HIGH LOW 50 5kHz HIGH LOW 100kHz HIGH LOW C V Calibrated Value Model 4277A SECTION IV PERFORMANCE TEST RECORD m 4 19 RESISTANCE ACCURACY TEST Cont d Paragraph Number 200kHz HIGH LOW 505kHz HIGH LOW 1MHz HIGH LOW Ik Range Frequency Test Signal 10kHz HIGH C V 0 006kKk Q LOW 012k8 C ael 0 006k8 012k8 20kHz HIGH C LOW 0 006kt 012k6 C V 40 006kQ 012k lt lt 5
88. XT Measurement is triggered each time this key is pressed Measurement data is held until the next time the key is pressed Or in this mode measurement is triggered by an external trigger signal applied to the rear panel connector 4 in Figure 3 2 TEST SIGNAL LEVEL Selector Key and Indicators This key selects two test signal levels HIGH and LOW HIGH level is 1Vrms and LOW level is 20mVrms The selected test signal level is indicated by the corresponding LED lamp MEASUREMENT SPEED Select Key and Indicators This key selects three measurement speeds SLOW MEDIUM or FAST Actual measurement speed depends on test frequency LC Z range 6 DISPLAY A Funetion 3 and the value of the device under test The selected measurement speed mode is indicated by the eorresponding LED lamp SLOW Measurement speed is approxi mately 1 4 that of medium measurement speed MED Measurement speed is approxi mately 14 measurements per second in C G measurement mode FAST Measurement speed is approxi mately one and a half that of medium measurement speed EXT TRIGGER SECTION II 63 DISPLAY B Function Select Key and Indicators This key 9 selects the measurement parameter for display on DISPLAY B 8 The selected parameter is indicated by the eorresponding LED lamp Pressing this key shifts the selected parameter in a top to bottom sequence Selectable parameters are as follows D Measures the dissipation f
89. a MED ERIGOE Pzd Zaz d a INT DC BIAS switch SPSASSSCSCS TESST SSSHSSSSHSCAE RESCH KRA PI ET ED OFF CABLE LENGTH switch cs sss sassa aa ananas asa rax 0 Other controls ezR AREGOL UORKOLYYTOORO ERG p KE tP 9484 Any setting 2 Perform Open and Short zero offset adjustments as described in steps 1 3 6 and 7 of paragraph 4 15 3 Connect the 1002 standard resistor directly to the UNKNOWN terminals as shown in Figure 4 3 a 4 Set test frequency and TEST SIG LEVEL in aeeordance with Table 4 8 Absolute values of the impedance readings should be within the test limits given in the table 5 Change the standard resistor to 1kQ LOkN and 100kQ in that order and verify that the impedance readings are within the test limits given in Table 4 8 SECTION IV PERFORMANCE TESTS Table 4 8 Resistance Aceuracy Tests Standard 1009 Resistor A 000000 C V Calibrated Value of Standard Resistor Table 4 8 Resistance Accuracy Tests continued Test Limits Standard Resistor 0 06k9 0 06kKkQ 0 06kQ 0 06k8 0 06kQ 0 06kQ t0 06kKkf Model 4277A Model 4277A SECTION IV PERFORMANCE TESTS 4 21 PHASE ACCURACY TEST 4 22 This test cheeks to the accuracy of phase measurements over the full frequency range The phase accuracy test is made by connecting a resistor with extremely low reactive elements and by reading the displayed phase angle almost zero to verify that the
90. acitance externally supplied de bias voltages up to 200V measurements using Connect a de voltage source to the 16065A as shown in the diagram CAUTION DO NOT APPLY GREATER THAN 40V TO THE 4277A S EXT INPUT INT MONITOR CONNECTOR IF THE APPLIED VOLTAGE EXCEEDS 40V THE 4277A MAY BE DAMAGED PROCEDURE 1 Set DC BIAS select switch on rear panel to OFF Set CABLE LENGTH switch on the front panel to Im Connect the 16065A to the UNKNOWN terminals of the 42774 Connect the de voltage source to DC BIAS INPUT connector of the 16065A Connect a DVM or an oscilloscope to the DC BIAS MONITOR connector of the 16065A Turn on the instruments Set the 4277A s eontrols as deseribed in steps 5 through 7 of Figure 3 20 Set the DISPLAY A funetion to C measurement mode Perform OPEN and SHORT Zero Offset Adjustments SECTION III OC VOLTAGE SOURCE 9 Connect a sample to the 16065A test fixture CAUTION DO NOT SHORT THE HIGH AND LOW TERMINALS CAUTION WHEN A POSITIVE BIAS VOLTAGE IS USED THE POSITIVE TERMINAL OF ELECTROLYTIC CAPACITORS MUST BE CONNECTED TO THE INSTRUMENT S HIGH TERMINAL WHEN USING A NEGATIVE BIAS VOLTAGE CONNECT THE CAPACITOR S NEGATIVE TERMINAL TO THE INSTRUMENT S HIGH TERMINAL 10 Set the external de voltage source to the 11 desired output voltage and close the cover of the 16065A Read the measured values Wait until the monitored voltage becomes stable
91. aetor of the DUT DISPLAY A Funetion must be set to L induetance or C eapacitance Q Measures the quality factor of the DUT DISPLAY A Funetion must be set to L induetance or C capacitance Q values are calculated as the reciprocal dissipation factor ESR G Measures the equivalent series resistance or conductance of the DUT DISPLAY A Funetion must be set to L inductance or C capacitance ESR i selected when CIRCUIT MODE is set to two G is selected when CIRCUIT MODE is set to LC Z RANGE Seleetor Keys and Indicator These keys seleet the measurement range and the ranging method for inductance capacitance and impedance measurements AUTO when indicator is lit Optimum range for the DUT s value is automatically selected MANUAL when indicator is not lit Measurement range is fixed even when the DUT is changed Manual ranging is done by pressing the adjacent DOWN 8 or UP G key Note Pressing the DOWN or UP key sets the ranging mode to MANUAL even if the ranging mode was initially set to AUTO Figure 3 1 Front Panel Features Sheet 4 of 6 3 5 SECTION III Model 4277A UNKNOWN tie Hy iros MEX mes x iza O00 i iG 7 CIRCUIT MODE Select Key and Indicators This key selects the measurement circuit mode to be used during measurement The selected circuit mode is indicated by the corresponding LED lamp AUTO Automatically seleet
92. an extremely low residual reactance at frequencies to 1MHz The HP 16074A Standard Resistor Set especially designed as standards useable over a broad frequency region with thin film resistors and four terminal pair configurations is suitable for the accuracy checks Because of low residual inductance and less skin effect of the thin film resistors the 16074A provides the standard resistance values of 02 0 10 12 and 102 at 10 and 1002 1kQ 10kQ and 100kQ at 0 01 calibration accuracies to 10MHz 1MHz at 100k Open OS and Short terminations which facilitate optimum zero offset adjustment and two quasi inductors are ineluded in the 16074A Note The 02 and10 resistors are used as the pure resistance reference device in the Phase Accuracy Test The 0 10 1Q and the quasi inductors are not used in the 4277A performance tests Model 4277A Model 4277A SECTION IV 3 Induetance Aceuracy Test The 4277A inductance accuracy is theoretically certified if the capacitance accuracy meets the specifications Generally inductors have unwanted parasitic impedances such as coil resistance and distributed capacitance As these residuals significantly affeet the inductance values at high frequencies induetance standards useable in the RF region above 100kHz are substantially unavailable Inductors with higher inductance values have lower frequency limits GENERAL The standards should be of four terminal pair configuration design to provid
93. and the effects of dielectric materials in capacitors Here we ll discuss only the effects which result from the interaction of the reactive elements L C ete of a component 3 59 The impedance of a component can be graphically represented in vector form as shown in Figure 3 17 In such representation the effective resistance and effective reactance eorrespond to the projections of the impedance vector Z 6 that is the real R axis and the imaginary jX axis respectively as shown below Re Z cos6 Xe Z sina _ cos 1 ging tang where Re Effective resistance Xe Effective reactance Z Impedance of the sample Re jXe D Dissipation factor Figure 3 17 Impedance Vector Representation SECTION III When the phase angle 0 ehanges both Re and Xe change in accordance with the definitions above As eomponent measurement parameters L C R D ete are also representations of components related to the impedance vector the phase angle dominates their values Consider for example the inductance and the loss of an inductive component at frequencies around its self resonant frequency Figure 3 18 shows the equivalent circuit of the inductor The inductanee Lx resonates with the distributed eapacitance Co at frequency fo The phase angle 8 of the impedance vector approaches 0 degrees the vector approaches the R axis when the frequency is close to the resonant frequency Thus the induc
94. asure the monitor voltage Vo at the EXT INPUT INT MONITOR connector Connect a reference resistor Ro e g 100241 to the test fixture Measure the de voltages at the HIGH and LOW terminals of the test fixture and at the EXT INPUT INT MONITOR connector Vy Vi and Vx Note Connect the LOW terminal of the DVM or the oscilloscope to the GUARD terminal of the instrument Calculate the resistances Ri R and Ra using the following equations Ri 72 Vo Vx Ro Vy Vi R2 Vk Vu Ro Vh V1 Ri Vi Ro Vi Vi Figure 3 32 Internal DC Bias Voltage Monitor Sheet 1 of 2 3 14 Model 4277A 2 Actual Bias Voltage Current Measurement a b e d Connect nothing to the test fixture Measure the monitor voltage V o Conneet the desired sample to the test fixture Measure the monitor voltage Vw e SECTION III Caleulate the actual voltage applied to the DUT V or the actual current through the DUT I using the following equations Iz Vg Vy y Ra V Vo R R2 TR Note Repeat step 2 each time the DUT is changed since the monitor voltage Vu depends on the DUT impedance Figure 3 32 Internal DC Bias Voltage Monitor Sheet 2 of 2 3 75 SECTION MI 3 113 OPTION 002 COMPARATOR HANDLER INTERFACE 3 114 Option 002 equips the standard 4277A with a comparator function and a handler component sorter interface capability The eomparator provides go no go
95. asurement range and status and BIN number data of Comparator are each represented as a number as listed in Table 3 15 Note Values displayed on DISPLAY A and DISPLAY B are output as number of counts Actual measured values are obtained with measurement range and output data values Note The EOI signal is output with the last data byte Figure 3 25 Data Output Format for the 4277A Sheet 2 of 2 Model 4277A Table 3 14 Data Output Codes for ASCII Mode Circuit Mode oft D S a S Data Status of DISPLAY A B Normal Normal on Deviation Measurement Overflow Underflow Change Function Blank used only for DISPLAY B DISPLAY A L C HIGH SPEED L HIGH SPEED C FA Function of Function of DISPLAY B D Q ESR G 9 HIGH SPEED L HIGH SPEED C zzz oe Data Status Bin IN L C IZ for HIGH Comparator LOW Embedded Undefined Data Status of Limit IN I D Q ESR G for HIGH H Comparator LOW L Undefined yes Out of Bin BINI BIN2 BINS3 BINA BINS BING BIN7 BINS BINS Bin Number WO 00 TG UT HA WHF HIGH SPEED C and HIGH SPEED L have the same output codes 2 This code appears when the measurement value is between two continued bins This code appears when DISPLAY A or B indicates CF or biank SECTION Hl 3 61 SECTION Hi 3 62 Model 4277A Table 3 15 Data Output Codes for
96. be used Specifier for entering one byte 8 bit of binary data Specifier for entering two bytes 16 bit of binary data Figure 3 27 Sample Program 1 Sheet 2 of 2 Sample Program 2 Deseription The remote program code LN ean be used to read the front panel control settings and comparator settings This program shows how to use LN Program 10 REMOTE 717 20 CLEAR 717 30 DIM A L60 40 OUTPUT 717 LN 50 ENTER 717 A 60 DISP A 70 PRINT A 80 END Figure 3 28 Sample Program 2 3 67 SECTION HI 3 68 Sample Program 3 Deseription This program shows how to input low and high bin limits instrument is equipped with Option 002 Program 10 REMOTE 717 20 CLEAR 717 30 DIM A 50 40 OUTPUT 717 A2B1RAT2POF2 1 50 OUTRUT FRIOOEN 60 OUTPUT 717 E1GOER 2 70 OUTPUT 717 LINILL 995ENLH 998EN 2 3 80 OUTPUT 717 N2LLIENLHLIEN 90 OUTPUT 717 N3LL 1 0001 ENLH1 2EN OUTPUT 717 L2LLOENLH 001EN OUTPUT 717 G1 OUTPUT 717 EX ENTER 717 A DISP A PRINT A END Measurement range must be set Program codes for comparator setting Program codes for inputting low and high bin limits Figure 3 29 Sample Program 3 via the HP IB Model 4277A when the Model 4277A SECTION HI Sample Program 4 Deseription The remote program code LR ean be used to recall the high and low limits for each bin This program shows how to use LR
97. cusses how the 4277A aceuracy is tested and verified As the 4277A has wider measurement capabilities in regard to the selectable measurement parameters frequency measurement range and accuracy the performance tests include some critical measuring regions where accuracy is difficult to verify directly by measuring available standards Measurement accuracy is tested by measuring standard capacitors resistors and other reference devices The standards must have been calibrated and certified by transfer of values of national standards However a portion of the measurement range of the 4277A is out of the applicable ranges of the available standards The method then is to check accuracies by comparison with references on the specifie ranges at which the standards are applicable and to apply alternative tests for verification of accuracies on the other ranges Theoretical Background of Accuracy Checks The 4277A in accordance with its measurement principles determines the vector impedance or its reciprocal value admittance of the unknown device under test The various measurement data provided with respect to the 8 selectable measurement parameters L C D ete are arithmetically derived from measured values of the orthogonal vector components resistance and reactance For example the capacitance value of a DUT is calculated by the following equation relative to the capacitance to reactance values EEEE CX 7 En where Cx is capaci
98. cy 10kHz 20kHz S C V 20pF C V 20pF 20 2kHz 50 5kHz 100kHz C C V 0 36pF C V 0 36pF 200kHz 202kHz 505kHz 1MHz C C V 0 20pF C V 0 20pF 1000pF Range Test Signal Level HIGH Frequency lOkHz C C V 0 0018nF C V 40 0018nF 0 0016 0 0016 20kHz 0 0025nF 0 0026 C V 0 0025nF 0 0026 20 2kHz C G V 0 0027nF C V 0 0027nF 0 008 0 008 50 5kHz C C V 0 0021nF C V 0 0021nF 0 0022 0 0022 C V Caribrated Value viii Model 4277A SECTION IV PERFORMANCE TEST RECORD Results Paragraph Number 4 17 CAPACITANCE ACCURACY TEST Cont d 100kHz C C V 0 0018nF C V 40 0018nF D 0 0016 0 0016 200kHz C C V 0 0023nF C V 0 0023nF D 0 0026 0 0026 202kHz C C V 0 0027nF G V 0 0027nF D 0 008 0 008 505kHz C C V 0 0021nF C V 0 0021nF D 0 0022 0 0022 1MHz 0 0015nF V 0 0015pF D 0 0016 0 0016 Test Signal Level LOW Frequency D 0 0032 0 0052 G V 0 014nF 20kHz C C V 0 014nF 0 014 D 0 014 20 2kHz C C V 0 014nF C V 0 014nF 10kHz C C V 0 0036nF D 0 11 0 11 50 5kHz C C V 0 013nF C V 0 013nF D 0 015 0 013 100kHz C C V 0 0036nF C V 0 0036nF D 0 0032 0 0032 200kHz C C V 0 014nF C V 0 014nF D 0 014 0 014 202kHz C C
99. d POETY 4440000 HP 16383A PROCEDURE l 2 GI Turn off the 4277A and the HP 85 off Connect the 82937A HP IB Interface between the HP 85 and the 4277A as shown in Figure 4 9 and install the I O ROM in the ROM Drawer of the HP 85 Set the 4277A s HP IB Control Switch located on the rear panel as follows bits 5 1 10001 17 0 bit 6 0 bit 7 0 Turn on the 4277 A and the HP 85 Load one of the three test programs into the personal computer Test programs are listed on pages 4 26 and 4 28 and 4 30 Exeeute the program and follow the prompts and instruetions that are output by the HP 85 Details on the controller s personal computer instructions and the appropriate operator response are given in Tables 4 12 through 4 14 SECTION IV PERFORMANCE TESTS Model 4277A 4 26 TEST PROGRAM 1 PURPOSE This test verifies that the 4277A has the following HP IB capabilities 1 Remote Loeal Capability 2 Local Lockout 3 Talk Disable 4 Lis ten Disable PROGRAM LISTING 1G zo 30 ZU S EG 7O go CR bo m m O OO O m G REMOTE M i 42798 HP IB TEST No REMOTE LOCRL TEST DIM R 111 N Q Me Q Mis 17 5 SPOLL CH12 M CLERR PRINT xxx 4277A HP IB TEST Ne sex DISP REMOTE LOCRL TEST OUTPUT Mt T1 DISP LISTEN 1 TALK 0 REMUTEST GOSUE 580 RB RTIU M DISP LISTENS TALK O REMOTE s 1 GOSUB 580 DCRL M ISP LISTEN O TRLKsO REMO TE O
100. d MED Test Signal Level HIGH DISPLAY A 1 0010 0 9990 DISPLAY B 0 0010 0 0010 LOW DISPLAY A 1 0020 0 9980 DISPLAY B 0 0020 0 0020 Measurement Speed FAST Test Signal Level HIGH DISPLAY A 1 0050 0 9950 DISPLAY B 0 0050 0 0050 LOW DISPLAY A 1 0100 Sa 2 0 9900 DISPLAY B 0 0100 rue 0 0100 ii PERFORMANCE TEST RECORD P aragraph TEST Number Minimum Maximum SELF OPERATING TEST Cont d Frequency 1MHz Measurement Speed MED Test Signal Level HIGH DISPLAY A DISPLAY B LOW DISPLAY A DISPLAY B Measurement Speed FAST Test Signal Level DISPLAY A DISPLAY B HIGH LOW DISPLAY A DISPLAY B SELF TEST 3 Standard Open 0S 200 counts 0 10pF 200 counts 0 100pF 200 counts 0 1000pF counts 0 OPEN SHORT TEST OPEN Test Signal Level HIGH Frequency 10kHz 0 0008nF 0 07u 0008nF 0 07uS 20kHz 0 0015nF 0 11uS 0013nF 0 1185 20 2kHz 0 0017nF 0 0008m5 0017nF 0008mS 50 5kHz C 0 0011nF 0 0008mS 001inF 0008mS 100kHz C 0 0008nF 0 0007mS 0008nF 0007mS ii SECTION IV Model 4277A PERFORMANCE TEST RECORD Paragraph TEST ee 4 15 OPEN SHORT TEST Cont d 200kHz C 0 0013nF 0 0013nF G 0 0011mS 0 0011mS 202kHz C 0 0017nF 0 0017nF G 0 008mS 0 008mS SO5kHz C 0 0011nF 0 0011nF G 0 00
101. d from the front panel or via the HP IB It is performed after the Display test described in paragraph 3 9 and it confirms correct operation of the instruments analog circuits Like the Display test this test is repeated until the self test function is turned off The test lasts approximately three seconds If a malfunetion is detected an error code will be displayed on DISPLAY A Refer to Table 3 4 Note The Analog Cireuit test must be performed with an open terminated no DUT test fixture eg 16047A connected to the UNKNOWN terminals Note If one or more of the error codes listed in Table 3 4 appear on DISPLAY A during the Analog Circuit test contact the nearest Hewlett Packard Sales or Service Office for repairs 3 13 MEASUREMENT FUNCTIONS 3 14 Values displayed on DISPLAY A and DISPLAY B are for the parameters selected by the DISPLAY A and DISPLAY B funetion keys Inductance L capacitance C or impedance magnitude Z values are displayed on DISPLAY A dissipation factor D quality factor Q equivalent series resistance ESR eonduetanee G or impedance phase 6 values are displayed on DISPLAY B The DISPLAY B measurement funetion depends on the selected DISPLAY A function and the selected CKT MODE as listed in Table 3 1 When DISPLAY A 3 10 a p LEM Model 4277A funetion is HIGH SPEED C or HIGH SPEED L DISPLAY B is always blank Table 3 1 Measurement Funetions DISPLAY B HIGH SPE
102. e SLOW measurement speed minimizes display fluctuation Note Best measurement accuracy is obtained when test signal level is set to HIGH and measurement speed is set to MED Perform OPEN and SHORT Zero Offset adjustments as described in paragraph 3 51 Conneet the device to be measured to the test fixture Read the measured values from DISPLAY A and DISPLAY B Note Refer to paragraph 3 20 for the meaning of any error codes that may appear on DISPLAY A Note When the instrument is set to C D or C Q measurement mode and nothing is connected to the measurement terminals CF and 0000 may be alternately displayed on DISPLAY A This is not a malfunetion however Note For C or L measurement if the dissipation factor of the DUT is higher than 0 1 C L and D measurement accuracy tolerances increase by a factor of 1 D If D is higher than 1 AUTO ranging eannot be performed correctly Z measurement mode should be seleeted Figure 3 20 General Component Measurements Model 4277A Parameters of semieonductor devices have a strong dependency on the applied voltage and device temperature Because of the non linear impedance chanracteristiecs of semiconductor devices a semiconductor measurement is subjeet to exact establishment of the test conditions to make measured values meaningful For a detailed analysis of the device under its SECTION IM operating test conditions a low level test s
103. e compatibility with the instrument This minimizes reduction in reliability of the values due to the effects of the residuals associated with cabling and connections T e SECTION IV Model 4277A PERFORMANCE TESTS 4 9 TEST FREQUENCY ACCURACY TEST 4 10 This test verifies that test signal frequencies for the 4277A meet the specified frequency aceuracy of 0 01 42774 5314 A See KTM 5 toclsodiong og 8 po l lo BNC to BNC Cable Figure 4 1 Test Frequency Accuracy Test Setup EQUIPMENT Frequency Counter sss sssess ees scsce erase r raser nra sanar nnn anns HP 5314A BNC Un BNO CADIE pasie ion en xis sar EU stk Kan 7 PROCEDURE l Connect the frequency counter to the 4277A UNKNOWN Hc terminal as shown in Figure 4 1 2 Set the 4277 A s controls as follows TEST SIG LEVEL ie esessvetevyes m HIGH DC BIAS SWITCH Lo eee ris dant coxa qu MR OFF Test Frequency us otia ive EXE FEAR RR dca chess PORTE Other controls 9 x gs Xa SKaR vadevekx vo eru eran ses ess Any setting 3 Verify that the frequency reading on the 5314A is 10 000kHz 1Hz 4 Set the test frequeney in the sequenee given in Table 4 2 Verify that the frequency readings on the 5314A are within the test limits given in the table Table 4 2 Test Frequency Accuracy Test 10 0KHz 9 999 to 10 001kHz 100kHz 99 99 to 100 01kHz 202kHz 201 98 to 202 02kHz 500kHz 499 95 to 500 05kHz 1 00MHz 0 9999 to 1 0001MHz N
104. e I Note If the instrument is set to TALK ONLY mode the Output Data Format number will be briefly displayed on DISPLAY A instead of the HP IB address when the instrument is turned on The displayed number however will be the format number plus 50 For example if the Output Data Format is F3 the number displayed on DISPLAY A at turn on will be 53 Table 3 16 Output Data Formats Output Data Dispiay A Display B Output Mode Mode ASCII PACKED BINARY SECTION II 3 100 LEARN MODE DATA 3 101 All front panel settings and comparator key settings are output from the 4277A when the program code LN is used refer to Figure 3 28 The data is output in the following format FRnnnnEN An Bn Cn Dn Fn Mn Pn 2 2 3 4 5 6 7 8 e rrm marn nece BitnnnnEN En Gn Ln Nn CB 15 16 17 18 19 20 1 Test Frequeney Setting 2 AL A5 DISPLAY A Function 3 B1 B3 DISPLAY B Function 4 C1 C3 Circuit Mode 5 DO Dl Data Ready 6 Fl F4 Output Data Format 7 M1 M3 Measurement Speed 8 PO Pl Output Data Mode ASCII or Paeked Binary 9 RI R8 LC IZ Range 10 S0 S1 Self Test 11 TI T2 Trigger Mode 12 U0 Ul Auto Range 13 V1 V2 Test Signal Level 14 X0 X1 Deviation Measurement 15 DC Bias Setting 16 E0 El Comparator Enable 17 G0 G1 Comparator Run 18 Ll L2 Comparator Limit Input 19 NL N9 Comparator Bin Number for L C Z
105. e ranges which can be selected at each test frequency and the range resistor used on eaeh range are shown in Figure 3 5 Each range allows a 100 overrange of the 10000 full seale eounts maximum 19999 eounts Figure 3 4 shows the number of display digits for each measurement funetions Measurement range is selected by the LC Z RANGE keys When the LC Z RANGE control is set to AUTO the optimum range is automatically selected for eaeh measurement Manual ranging is also possible When an inappropriate range is selected OF or UF is displayed on DISPLAY A or DISPLAY B where Vosc Oscillator Level 1 Vems or 20m Vrms Vr Test Signal Level Z DUT Impedance Figure 3 3 Equivalent Circuit of the Test Signal Source 3 16 Model 4277A SECTION IJI NUMBER OF DISPLAY DIGITS Tables 1 1 through show the number of significant digits displayed for eaeh of the 42711 A s d easurement parameters The three number combinations given in the tables indieate the number of display digits for the respeetive measurement range and test frequency for each measurement speed For example if MED measurement speed is seleeted use the middle number if FAST is seleeted use the right most number X X X display digits SLOW FAST The number of display digits is defined as follows A full seale factor is used in Figure A through Figure N It is defined as follows Full seale factor measured value full scale va
106. ed the test will stop and an error code will be displayed on DISPLAY A If the ROMs and RAMS are funetioning properly the instrument will display the HP IB address or output data format if the HP IB control switch is set to TALK ONLY on DISPLAY A and the option annunciations on DISPLAY B and the FREQUENCY DC BIAS DISPLAY Error codes are deseribed in paragraph 3 20 Note if a ROM RAM test error eode E61 through E68 appears on DISPLAY A when the instrument is turned on eontaet the nearest Hewlett Paekard Sales or Service Office for repairs Note ROM RAM test error code E608 indicates that the instrument s continuous memory feature is not funetioning properly All other instrument functions ineluding measurement are not affected 3 9 DISPLAY TEST 3 10 All LED lamps and 7 segment displays on the front panel are lit for approximately one second when the instrument s self test function is initiated from the front panel or via the HP IB This test is repeated until the self test function is turned off SECTION HI U DISPLAY A Model 4277A ZE E UNKNOWN G REV Aus wee MAY A AS AR ZA d eOOOOF T3 BS is 2a 8 13 LINE OFF ON Switch Applies ae line power to the instrument when set to the ON m in position Removes ae line power when set to the OFF W out position HP IB Status Indicators and LOCAL Key These four LED lamp
107. edance although small degrades the aceuracy of low impedance measurements The stray admittance of the test fixture Go and Co in Figure 3 12 b is shunted by the low impedance shorting bar and therefore is not measured Once OPEN and SHORT Zero Offset Adjustments have been made the instrument automatically compensates all subsequent measurements for the residuals and strays of the test fixture or test leads The values displayed on the front panel are the actual values of the DUT Also because the Zero Offset data is maintained by the instrument s continuous memory funetion OPEN and SHORT Zero Offset Adjustments do not have to be repeated each time the instrument is turned on You need to repeat Zero Offset Adjustments only when you change test fixtures the residuals and strays of one test fixture are different from those of another Maximum values that can be offset are listed below Figure 3 12 Equivalent Circuits for Zero Offset Adjustment Model 4277A Capacitance Up to 20pF OPEN Conductance Up to 215 Inductance Up to 2uH SHORT Resistance Up to 22 Note During Zero Offset Adjustment OF or CF may appear on DISPLAY A or DISPLAY B Zero Offset Adjustment however is performed correctly unless error code E10 is displayed Note After Zero Offset Adjustments CF and 0000 may be alternately displayed on DISPLAY A if the measurement mode is other than C G and nothing is connected to the test fixture Th
108. el 4277A and Accessories SECTION I 1 6 The 4277A has three measurement speed modes SLOW MED and FAST When MED mode is selected total time required for a C D or L Q measurement is approximately 70ms at 1MHz FAST mode measurement time is approximately 25 percent shorter than that of MED mode Also the HIGH SPEED C and HIGH SPEED L measurement functions reduce measurement time to approximately half that of a normal C D or L Q measurement Shortest measurement time is approximately 35ms HIGH SPEED C or L FAST mode at IMHz The 4277A is equipped with a A delta measurement funetion to permit temperature dependency or de bias dependency measurements l 7 All instrument operations measure ment front panel eontrol settings ranging triggering HP IB displays self test continuous memory ete are controlled by a Z80 mieroproeessor The built in self test function ean be initiated at any time to verify correct operation of the instrument s basic capabilities The 4277A is also equipped with a continuous memory funetion that is automatically aetivated when the instrument is turned off or experienees a power failure All front panel control settings except de bias zero offset data and comparator limits Option 002 are memorized and automatically recalled when the instrument is turned on again 1 8 The Hewlett Packard Interface Bus HP IB is standard on the 4277A All of the instrument s standard and optional func
109. el for the 6lcm test cable from HP 111708 to PN 8120 1839 Change the Recommended Model for the 30cm test cable from HP 11170A to PN 8220 1838 NOTE Manual change supplements are revised as often as necessary to keep manuals as current and accurate as possible Hewlett Packard recommends that you periodicaliy request the latest edition of this supplement Free copies are available from all HP offices When requesting copies quote the manual identification information from your supplement or the model number and print date from the title page of the manual Page 1of 3 Date Div Aug 14 1986 33 dinan QU Printed in Japan Pages 4 6 and 4 7 Paragraphs 4 9 Test Frequency Accuracy Test and 4 11 Test Signal Level Accuracy Test Under EQUIPMENT change the model number of the BNC to BNC cable from HP 11170A to PN 8120 1838 Page 5 8 Paragraph 5 21 Test Signal Level Adjustment Under EQUIPMENT change the model number of the BNC to BNC cable from HP 11170B to PN 8120 1839 Pade 6 7 Table 6 3 R biadeabie Parts Change the part numbers and descriptions of A206 through Q10 to 4 as follows Q6 and Q10 1854 1041 TRANSISTOR NPN Q2 035 and Q4 1855 0571 TRANSISTOR FET Page 6 18 Table 6 3 Replaceable Parts Change the part number of item 50 to 1510 0130 Page 8 65 Figure 8 41 Al LOGIC Board Troubleshooting Flow Diagram Delete pin 23 and the associated signature from Signature Set 8 1 Page 8 67 Figure 8 4
110. ement is illustrated in Figure 3 9 SECTION HI At first glance the arrangement appears to be an expanded four terminal method with a built in guard structure This is true Thus the four terminal pair method combines the advantages of the four terminal method in low impedance measurements while providing the shielding required for high impedance measurements The distinetive feature of the four terminal pair configuration is that the outer shield works as the return path for the test signal current The same current flows through both the center conductors and the outer shield eonduetors in opposite directions yet no external magnetic fields are generated around the conductors the magnetic fields produced by the currents through the inner and outer conductors completely cancel each other Because the measurement signal current does not develop an inductive magnetic field the test leads do not contribute additional measurement errors due to mutual induetance between the individual leads Hence the four terminal pair method provides best measurement accuracy while minimizing the effeets of stray eapacitance and residual inductance inherent in the test leads or test fixture Note Because test leads have residual inductance the resultant additional measurement error increases in capacitance measurements in proportion to the square of the test frequency Figure 3 8 Four Terminal Pair DUT Connections 3 37 SECTION I
111. ent address When this bit switch is set to 1 however the instrument is in TALK ONLY mode Bit switch 6 determines the output data delimiter When this bit switch is set to 0 the delimiter is a comma when set to 1 the delimiter is a carriage return and line feed CR LF Note The HP IB Control Switch as set at the factory is shown in Figure 3 24 Note The HP IB Control Switeh setting is memorized only at instrument turn on Thus even if the HP IB Control Switeh setting is ehanged while the instrument is turned on the memorized setting is not ehanged until the instrument is turned off and on 3 88 ADDRESSABLE MODE 3 89 When bit switeh 7 of the HP IB Control Switch is set to ADDRESSABLE i e set to 0 bit switehes 1 through 5 represent the HP IB address of the instrument in binary These Switches are set to 10001 decimal 17 when the instrument leaves the factory but can be set to any desired address between 0 and 30 Note When the instrument is turned on the HP IB address is displayed in decimal on DISPLAY A For example the faetory set address 10001 is displayed as IT Note HP IB address 11111 deeimal 31 cannot be used If this address is set E19 will be displayed on DISPLAY A after 31 has been displayed when the instrument is turned on SECTION HI 3 90 TALK ONLY MODE 3 91 When bit switch 7 of the HP IB Control Switch is set to TALK ONLY i e set to 1 the instrument fu
112. epresented by a simple series or parallel equivalent circuit consisting of resistive and reactive elements This is possible because both equivalent circuits have identical impedances at a given test frequency by properly establishing the values of the equivalent circuit elements The equivalent circuit measurement mode is selected by setting the CIRCUIT MODE control When the CIRCUIT MODE is set to AUTO the 4277A wil automatically select the circuit mode most appropriate for the range and funetion settings Equivalent series eircuit mode is automatically selected when the measurement range is 1008 or below Equivalent parallel eircuit mode is automatiealy seleeted when the measurement range is 1k or above By setting CIRCUIT MODE manually either circuit mode can be selected regardless all measurement ranges 3 34 Capacitance and induetanee measurements can be performed in either equivalent series circuit mode or equivalent parallel circuit mode However measured values obtained in each mode are different The difference in measured va ues is related to the loss factor of the sample being measured The impedance of a sample measured in both series and parallel circuit mode is the same at a particular frequency Therefore the following equations are satisfied G jB Model 4277A Expanding the above equation we have 1 R wCs G julp OEG Y 5 2 Das Aan R Gs R gecs where Cs ES equivalent series circuit
113. equirements of an IEC International Eleetromechanieal Committee Safety Class I instrument and is shipped from the factory in a safe condition 1 15 This operating and service manual eontains information eautions and warnings whieh must be followed by the user to ensure safe operation and to maintain the instr ment in a safe condition 1 16 INSTRUMENTS COVERED BY MANUAL 1 17 Hewlett Packard uses a two section nine character serial number which is stamped on the serial number plate Figure 1 2 attached to the instrument s rear panel The first four digits and the letter are the serial prefix and the last five digits are the suffix The letter placed between the two seetions identifies the eountry where the instrument was manufactured The prefix is the same for all identieal instruments it changes only when a change is made to the instrument The suffix however is assigned sequentially and is different for eaeh instrument The contents of this manual apply to instruments with the serial number prefix es listed under SERIAL NUMBERS on the title page 1 18 An instrument manufaetured after the printing of this manual may have a serial number prefix that is not listed on the title page This unlisted serial number prefix indicates the instrument is different from the one deseribed in this manual The manual for this newer instrument may be accompanied by a yellow Manual Changes supplement or have a different manual part number
114. er HH HP P N 1250 0080 4 ea SECTION IV lanna 4 14 1 2 Model 4277A PERFORMANCE TESTS Note Use the BNC f f adapters furnished with the HP 16380A standard capacitor set If the 16048A Test Leads are not available use the 1m Test Leads HP P N 16074 61600 furnished with the HP 16074A standard resistor set PROCEDURE 1 Set the 4277 A s controls as follows DISPLAY A function O NT C DISPLAY B function sss se ss asses Ra aes gers s D CIRCUIT MODE 5 a S OBCA sesa sss asses AUTO LC Z RANGE 999 5 9e200206 enetaescoocarae KIKI AUTO MEAS SPEED sortase s estavan 9 929984 9 99 9649 LALA MED TRIGGER LAA ALLA LAAL LALA 229 Y 96666 INT DC BIAS switch es srssrosessevosssoassssonsasesoase OFF CABLE LENGTH switch P tues Other controls KO ra TOT EA Any setting Note If Open Short Test paragraph 4 15 has not been performed before doing this test perform zero offset adjustment as deseribed in steps 1 3 6 and 7 of paragraph 4 15 2 Connect a IpF standard capacitor directly to the UNKNOWN terminals as shown in Figure 4 3 b 3 Set the test frequency and TEST SIG LEVEL in accordance with Table 4 7 a Capacitance and dissipation factor readings should be within the test limits given in the table 4 Change the standard capacitor to 10pF 100pF and 1000pF in that order and verify that the capacitance readings are within the test limits given in Table 4 7 a
115. es deviation A measurements on both displays When this key is pressed the values displayed on DISPLAY A 5 and DISPLAY B are stored as reference values The difference between values obtained in subsequent measurements and the stored reference values is ealeulated and displayed on each display The formula used to ealeulate the deviation is A B Where A is the measured value of the device under test and B is the stored reference value LC Z RANGE 6 is set to MANUAL when this key is pressed Also the deviation measurement funetion is turned off by pressing this key again or by changing the DISPLAY A function 18 DISPLAY B function 19 LCIZ RANGE or CIRCUIT MODE It may be turned off also if the test frequency is ehanged when the DISPLAY B funetion is ESR G 8 FREQUENCY DC BIAS Display 9 FREQUENCY DC BIAS Select Key and SECTION IM Displays test frequeney or DC bias voltage Option 001 only with 3 digits The three LED lamps located to the right of the display are unit indicators for displayed values On instruments equipped with Option 002 Comparator Handler Interface bin numbers are displayed on this display when the comparator is set to RUN Also on Option 001 instruments the number 001 is briefly displayed here when the instrument is turned on Indicators This key sets the FREQUENCY DC BIAS VEU the SPOT COARSE FINE Select 3 key and the FREQUENCY DC BIAS Step Con
116. es for measuring the base eolleetor junction capacitance C ob of an NPN transistor are given in Figure 3 21 Examples of Caleulating C and Measurement Aceuracies ESR G Front Panel Settings Test Frequeney 10kHz LCIZ RANGE iuf TEST SIG LEVEL HIGH MEAS SPEED MED Measured Values C 905uF ESR 32 G Lams Accuraeies C 3 50 of reading 3 counts 905uF x 3 5 x 905 100 003 0 0180uF ESR 2 of reading 30amQ 20m8 5 counts 38 x 2 100 30 x 905mQ 20mQ 50 550m8 mS x 550 300 1 83mS G Horn Figure 3 19 How to Caleulate Measurement Accuracies 3 45 SECTION H Model 4277A Connect the 16047A Test Fixture to the UNKNOWN terminals Turn on the 4277A Verify that the HP IB address and option eodes 16064 and 001 are displayed on DISPLAY A DISPLAY B and the FREQUENCY DC BIAS display respectively Note Option codes are displayed only if the eorresponding option is installed Note The HP IB address is set to 17 10001 when the instrument is shipped from the factory Press the SELF TEST key to verify that the instrument is functioning properly Refer to paragraph 3 5 SELF TEST If no error codes are displayed press the SELF TEST key again to turn off the SELF TEST function Select the measurement functions for DISPLAY A and DISPLAY B Set the test frequency test signal level and measurement speed Not
117. f Test frequency in MHz Measurement Function Note Table 4 does not apply when 1 C measurement is made on the 1pF range 2 C measurement is made on the 10pF range and LOW test signal level is used 3 lZ measurement is made on the IMQ range Note Error doubles when LOW test signal level 20mVrms is used 1 21 SECTION I Model 4277A Table 1 2 Supplemental Performance Characteristics Sheet 2 of 2 Additional Measurement Error of Test Fixtures Maximum additional errors attributable to the test fixtures Residual Impedance 16047A 16047C 16048A 16048B 16048D 16065A 16048C 16034B Additional Measurement Error when D gt 0 01 Add 5D when LOW test signal level is used 10D to the accuracies for HIGH SPEED C and HIGH SPEED L Additional Measurement Error when D gt 0 1 Multiply C L or D aceuracy by 1 D Settling Time after measurement range ehange Approximately 60ms Settling Time after frequeney change Approximately 300ms Settling Time after Test Signal Level Change Approximately 60ms Test Signal Settling Time in DC Bias applications The same as de bias voltage settling time DC Bias Voltage Settling Time Typical value for C measurement C lt 2000pF 99 of setting 99 9 of setting 99 99 of setting Continuous Memory Approximately 2 weeks at 23 C 5 C 1 22 Measurement Time Typical characteristies are shown in the figure belo
118. f counts see Tables A 1 and A 2 Note Use Table A 1 when the test frequency is 10kHz 100kHz or 1MHz Use Table A 2 for all other frequencies Note Accuracies obtained from Tables A 1 and A 2 are valid only for measurements made with the CABLE LENGTH switch set to 0m When the CABLE LENGTH switeh is set to 1m add the errors listed in Table A 3 to the aceuracies obtained from Tables A 1 and A 2 Table A 1 C D Aceuracies 10kHz 100kHz 1MHz only d 30pF 5 3 5a 3 5 0005 a 0006 5 003a 7002 3 rae t 1 3pF 5 i S008 3 0005 a 0006 5 3 0005 a 0006 sl 3 003a 002 3 3pF 5 1 3pF 5 0005 a 0006 5 3 0005 a 0006 3 30 F 10 1 30 F 5 1 E 5 0005 a 003 5 3 0005 a 0006 54 3 0005 a 0006 3 3 3 F i9 55 0005 a 003 5 3 F 10 0005 a 003 5 When LOW test signal level 20mVrms is used C accuracy is as follows 1 6 Model 4277A SECTION I Table 1 1 Specifications Sheet 4 of 17 Table A 2 C D Aceuracies Test Frequency Range Capacitance Range 10 1kHz to 20kHz 20 2kHz to 50kHz 50 5KHz to 99 5kHz 101kHz to 200kHz 202kHz to 500kHz SOSKH to 995kkz LOUP m i oS 3 IHE 1 05 100nF HRA 5 58 3 n 354 0008 a 0016 5 3 003a 7002 3 OM na Na Z
119. he DUT only when the DC BIAS select switch on the rear panel is set to INT and the DC BIAS ON OFF switch on the front panel is set to ON If the DC BIAS ON OFF switch is set to OFF OFF will be briefly displayed on the FREQUENCY DC BIAS display each time a new bias voltage is set The de bias voltage actually applied to the DUT depends on the impedance of the DUT and in most cases will be less than the voltage value displayed on the FREQUENCY DC BIAS display By eonnecting a DVM or an oscilloscope to the EXT INPUTANT MONITOR connector on the rear panel the de bias voltage actually applied across the DUT can be monitored Refer to Figure 3 32 3 10 Model 4277A Table 3 18 Bias Voltage Resolution 10 0V to 40 0V 100mV Note For the option 001 operation set the DC BIAS select switch on the rear panel to INT Model 4277A SECTION IH OPTION 001 INTERNAL DC BIAS OPERATION 1 Set the DC BIAS select switeh 1 to INT 9 Set the DC BIAS ON OFF switch to ON If you re measuring a capacitive DUT au sufficient time for the DUT to charge up to the applied voltage 2 Connect the 16047A Test Fixture to the 10 UNKNOWN terminals Note 11 Read the measured values displayed on Any of the test fixtures and test leads DISPLAY A and DISPLAY B listed in Table 1 3 ean be used for measurements requiring de bias 12 Set the DC BIAS ON OFF switch to OFF 3 Turn on the 4277A 13 Wait until the voltage across
120. he instrument is equipped with Option 002 Comparator Handler Interface the LOW LIMITs keyed in from the 16064A will be displayed on this display when the 16064A is set to ENABLE and RUN is off Decimal point location and engineering unit indicator lamp change when the LC ZI RANGE changes Figure 3 1 Front Panel Features Sheet 1 of 6 6 DISPLAY B Model 4277A Displays measured values of dissipation factor quality factor equivalent series resistance conductance or impedance phase angle with a maximum 4 1 2 digits maximum display is 10000 for quality factor 18000 for phase and 19999 for all other parameters Number of display digits depends on instrument control settings The nine LED lamps located to the right of the display are the engineering unit indicators for displayed values Measurement error messages OF UF and CF are also displayed on this display When the DISPLAY A Function is set to HIGH SPEED L or HIGH SPEED C or when an error eode is displayed on DISPLAY A 5 this display is blanked turned off by the microprocessor If the instrument is equipped with Option 002 Comparator Handler Interface and if the 16064A comparator is connected the number 16064 will be displayed on this display when the instrument is turned on Also the HIGH LIMITs keyed in from the 16064A will be displayed on this display when the 16064A is set to ENABLE and RUN is off A Key and Indicator This key enabl
121. ies Note Accuracies obtained from Tables B l and B 2 are valid only for measurements made with the CABLE LENGTH switch set to Om When the CABLE LENGTH switch is set to Im add the errors listed in Table B 3 to the accuracies obtained from Tables B l and B 2 Table B l L D Aeeuracies 10kHz 100kHz 1MHz only Test Frequency 100kHz 4uH 5 R 0005 a 0008 5 40nH 10 k 40nH 5 0005 a 005 5 0005 o 0008 4nH 10 0005 4 Model 4277A SECTION I Table 1 1 Specifications Sheet 10 of 17 Table B 2 L D Aceuracies f Inductance Range 30 3kkz ta 2G6GkHz i g 55 5 nH i 5 005 amp 005 5 2 1238 5 2 2 BOnH 5 2 60nH 5 LOGUE 15 0005 a F 0024 5 35 0005 a 0016 5 35 3 BnH 10 54 0005 a 008 b i2nF 10 6nH 10 5 0065 49 T 005 Equations in Tables B 1 and B 2 represent L Accuracy D Accuracy a Full seale factor measured L value full seale L value For example when the L value is 850nH on the 1000nH range o is 0 85 Additional Measurement Error for Land Dat IMHz wc L10uH Table B 3 1 of reading 001 a 06 of reading 00030 1 of reading 001a v 0005 a 0012 0005 u 0OS 23 22nH 8 58 5
122. ignal is employed in order to obtain measured values with respect to a local region around the operating test point selected for plotting characteristie parameter curves of the sample A typical procedure for measuring semiconductor junetion capacitance in P N and MOS junction devices is outlined below Measurement Setup The figure above shows a typical test setup for measuring the base collector junction capacitance Cob of an NPN transistor For this measurement the test fixture may be user designed A 4277A equipped with option 001 is ideal for controlling the de bias required for the measurement If de bias is not necessary setup and procedures associated with this measurement may be deleted PROCEDURE l Connect the test fixture or test cables to the UNKNOWN terminals of the 4277A 2 Turn on the 4277A 3 Set the 4277A s front panel controls as follows DISPLAY A C DISPLAY B G Test Freg 1MHz TEST SIG LEVEL LOW 4 Perform OPEN and SHORT Zero Offset adjustments as deseribed in paragraph 3 51 9 Set the DC BIAS SELECT switeh on the rear panel to INT Note If an external voltage source is used for de biasing set the DC BIAS SELECT switeh to EXT and eonneet the voltage Source output to the EXT INPUT INT MONITOR connector on the rear panel Note DC bias voltage whether supplied from the internal bias source or from an external bias source should be set to 0V at this time Note Use the
123. ill swamp out a high impedance DUT connected to the test fixture The residual impedance of the test fixture Ro and Lo in Figure 3 12 a is negligibly low and therefore does not affeet the accuracy of OPEN Zero Offset Adjustments ZERO SHORT The proeedure for performing SHORT Zero Offset Adjustment is as follows 1 Conneet the test fixture or test leads to the instrument s UNKNOWN terminals Note If test leads are used you must convert the four terminal configuration to a two terminal configuration Refer to paragraph 3 45 and Figure 3 8 2 Connect a low impedance shorting bar to the test fixture If you re using test leads simply connect the ends of the leads together 3 Press the ZERO SHORT button When the ERO SHORT button is pressed the instrument will be automatically set to L ESR measurement mode It will then measure the test fixture s residual impedance at each of the previously mentioned test frequencies The measured values are stored in the instrument s internal memory When offset adjustment is completed DISPLAY A and DISPLAY B will be blank for 1 or 2 seeonds after which the front panel controls will be reset to the settings that existed when the ZERO SHORT button was pressed The purpose of SHORT Zero Offset 3 40 Model 4277A Adjustment is to measure the test fixture s or test lead s residual impedance which as shown in Figure 3 12 b consists of Ro and Lo This residual imp
124. information refer to the 16064A Operation Note OUT OF BIN N C EXT TRIG pete cent EOM End of Measure EXT DCv2 Jexr DCV 2 COM BV GND rha K ha Figure 3 33 Pin Assignments for the Handler Interface Connector HP 16064A 3 76 Model 4277A SECTION HI OPTION 002 COMPARATOR OPERATION Connect the Model 16064A Example COMPARATOR HANDLER INTERFACE to the COMPARATOR HANDLER INTERFACE connector on the 4277 A s rear panel Conneet the desired test fixture to UNKNOWN terminals Turn on the instrument Perform OPEN and SHORT Zero Offset adjustments as deseribed in paragraph 3 51 Set the front panel controls as APRTOPRZJE for the desired measurement Press the ENABLE key GQ on the 16064A The LED lamp at the center of the key should come on Note If E16 is displayed or DISPLAY A press the ERASE button 2 on the 16064A to erase previously stored limits Enter the high low limits for L C Z or D Q ESR G Press the RUN key 3 on the 16064A The comparator will then begin comparing all measured values with the high low limits entered in step 6 The appropriate LED lamps LOW IN HIGH will be lit and the number of the bin whose high low limits fit the measured values will be displayed on the FREQUENCY DC BIAS display If the bin limits listed in Tables A and B are entered the measured values listed in Table C will eause the comparison results shown in Table D Note
125. ion I is the UNKNOWN terminals The measurement accuracy of the 4277A is guaranteed at the UNKNOWN terminals The conditions under whieh accuracy is specified are deseribed in Tabie 1 1 An example of the how to caleulate measurement aecuracy is shown in Figure 3 19 Examples of Caleulating C D and Q Measurement Aceuracies Front Panel Settings Test Frequency IMHz LC IZi RANGE 100pF TEST SIG LEVEL HIGH MEAS SPEED MED Measured Values C 148 97pF D 0005 Q OF Assume a value of Qm Aeeuracies Refer to Table 1 1 C 1 of reading 5 counts 148 97pF x 1 100 05pF 0 199pF D 3 of reading 0005 a 0006 5 counts 0005 x 3 100 0005 1 4897 0006 0005 00144 Q Qu x 00144 0005 1 Qu x 2 88 1 Note In this case Q aceuracy 2 88 times Q has no meaning because Q is overflow OF SECTION II 3 67 GENERAL COMPONENT MEASUREMENT 3 68 The procedures for measuring general eomponents induetors capacitors resistors are given in Figure 3 20 Almost any diserete component except for those having special shapes or dimensions ean be measured with this setup Special components may be measured by using test leads 16048A 16048B 16034B ete or by using specially designed user built fixtures instead of the 16047A Test Fixture 3 69 SEMICONDUCTOR DEVICE MEASUREMENT 3 70 As an example of a typical semiconductor measurement the procedur
126. irect attachment type designed especially for high frequency measurements requiring high accuracy Two screw knobs facilitate and ensure optimum contact between the test fixture electrodes and the sample leads DC bias up to 40V can be applied Test Fixture tweezer type for measurement of miniature leadless components such as chip capacitors Employs a three terminal eonfiguration tweezer probe suitable for high impedanee above 502 measurements 16034B DC bias up to 40V ean be applied Cable length 1m 1 24 Model 4277A SECTION I Table 1 3 Aecessories Available Sheet 2 of 3 Description Test Leads four terminal pair with BNC connectors for connecting user fabrieated test fixtures 16048A DC bias up to 40V can be applied Cable length 1m Test Leads four terminal pair with miniature RF connectors suitable for connecting user fabrieated test fixtures in systems applications DC bias up to 40V can be applied Cable length Im 4 6048C Test Leads with dual alligator clips for testing components of non standard shapes and sizes at frequencies below 100kAz Applicable measurement ranges Capacitance gt 1000pF Inductance gt 100uH DC bias up to 40V can be applied Cable length lm 1 25 SECTION I Model 4277A Table 1 3 Aecessories Available Sheet 3 of 3 Double shielded Test Leads four terminal pair with BNC connectors for c
127. is is normal it is not a malfunction Note OPEN and SHORT Zero Offset Adjustments cannot be performed without a test fixture 3 53 ACTUAL MEASUREMENT EQUIVALENT CIRCUIT 3 54 The test fixture or test leads used to connect a sample to the instrument s UNKNOWN terminals becomes part of the sample which the instrument measures The four terminal pair configuration employed in the 4277A minimizes residual impedance circuit The residual impedance inherent in the test fixture or test leads can be eliminated by the 4277A s ZERO offset function refer to paragraph 3 51 SECTION III Contact Z Contact Electrode Electrode Parasitic Impedances Incident to DUT Connections Figure 3 13 However the four terminal pair measurement system must be converted to a two terminal configuration at the sample because most components have only two terminals Moreover additional stray capacitance is introduced when the sample is eonneeted to the test fixture Figure 3 13 illustrates lead impedance and the stray capacitances between the eomponent s leads 3 55 Diverse parasitic elements present between the sample and the UNKNOWN terminalis will affect measurement results These parasitic elements are series resistive and reactive elements and parallel conductive and susceptive elements Figure 3 14 shows the equivalent circuit of the samples parasitic elements R jX is the sample s impedance In Figure 3 14 Lo represents
128. issipation faetor value of the sample The wider circuit mode selection capability of the 4277A which is free from these restrictions permits taking measurements in the desired eircuit mode and of comparing such measured values directly with those obtained by another instrument This obviates the inconvenience and necessity of employing instruments capable of taking measurements with the same equivalent circuit to assure measurement result eorrespondence Figure 3 7 Parallel and Series Parameter Relationship Table 3 9 Dissipation Factor Equations and Equivalent Circuit Conversion Formulas Circuit Mode Dissipation Factor Conversion to Other Modes Cs 1 D Cp R on L T DZ 3 35 SECTION M 3 35 INITIAL DISPLAY AND INDICATIONS 3 36 Each time the instrument is turned on the option eodes for installed options and the HP IB address are displayed on the front panel for approximately two seconds The HP IB address is displayed on DISPLAY A as shown below The factory set address is 17 10001 but any address from 0 00000 to 30 11110 ean be set Refer to the HP IB diseussion starting in paragraph 3 76 Note If the instrument is set to TALK ONLY mode the output data format number see paragraph 3 90 will appear on DISPLAY A instead of the HP IB address The following option code is displayed on DISPLAY B if the instrument is equipped with Op
129. k to Range 10 0k 20 0k 100k 200k 995k 1 00M 1H See 100mH Figure G See See Figure Ga Figure G F See 4 EUH See Figure G2 Dem G Note Shaded areas indicate that measurement cannot be performed Figure 3 4 Measurement Ranges and Number of Display Digits Sheet 6 of 16 3 22 Model 4277A Full Scale Factor S W FAST SECTION III Full Scale Factor 100k Test Frequency Hz Test Frequency Hz Note Frequency range is 18 1kHz to 19 9kHz Figure F MED SLOW FAST at 10k 100k 1MHz Full Scale Factor Figure Gi Figure G1 Note In Figures F and Gi numbers not enclosed in parentheses apply when Test Signal Level is HIGH numbers enclosed in parentheses apply when Test Signal Level is LOW Figure 3 4 Measurement Ranges and Number of Display Digits Sheet 7 of 16 3 23 SECTION III Model 4277A SLOW FAST Full Scale Factor Full Scale Factor 10k 100k iM Test Frequency Hz Test Frequency Hz Note Numbers not enelosed in parentheses apply when Test Signal Level is HIGH numbers enelosed in parentheses apply when Test Signal Level is LOW Figure G2 Figure 3 4 Measurement Ranges and
130. kHz L i 0 12uH 0 12yH 0 162 0 168 202kHz L 0 12uH 0 169 0 12uH 0 169 505kHz L 0 1luH 0 1luH 0 168 0 168 1MHz L 0 018uH 0 01 51H 0 108 0 108 SECTION IV Model 4277A PERFORMANCE TEST RECORD 4 17 CAPACITANCE ACCURACY TEST ipF Range Test Signal Level HIGH Frequency 202kHz V 0 0052pF 0 009 1 V 0 0052pF 0 009 505kHz V 0 0046pF 2 V 0 0046pF D 0 0040 0 0040 iMHz C C V 0 0043pF C V 0 0043pF 0 0040 0 0040 Test Signal Level LOW Frequency 202kHz 505kHz 10pF Range Test Signal Level Frequency 20 2kHz 50 5kHz 100kHz 200kHz 202kHz 505kHz 1MHz C V Caribrated Value vi Model 4277A SECTION IV PERFORMANCE TEST RECORD Paragraph TEST 4 17 CAPACITANCE ACCURACY TEST Cont d Test Signal Level LOW Frequency 20 2kHz dos T N 2 1pF 0 50 5kHz n 0 V 2 1pF szl 100kHz V 0 V 0 27pF 017 200kHz A ipF V IpF ELEC CE RN z E 202kHz V 0 14pF l 505kHz s d V 0 13pF 013 1MHz V 0 020pF 0 0032 100pF Range Test Signal Level HIGH Frequency 10kHz 20kHz 20 2kHz 50 5kHz 100kHz 200kHz 202kHz 505KkHz vii SECTION IV Model 4277A PERFORMANCE TEST RECORD 4 17 CAPACITANCE ACCURACY TEST Cont d 1MHz amp D Test Signal Level Frequen
131. l level 20mVrms is used Table A 3 Additional Measurement Error for C D at 1MHz Note 1 Table A 3 is applicable under the following conditions NI NM X005 9 of reading 1 Test Frequency IMHz 2 CABLE LENGTH Im 001 0 3 Test Signal Level HIGH 1Vrms 06 of reading 0003a 03 of reading OE 0002 05 of reading meer 00030 4 of reading 4 Sample s D Value lt 0 1 5 Test Leads Model 16048A or 16048B 6 Zero offset adjustment has been performed with the OPEN and SHORT terminations of the Model 160744 Note 2 Error doubles when LOW test signal level 20mVrms is used SECTION I Model 4277A Table l l Specifications Sheet 5 of 17 C Q Measurement Accuracy C Accuracy C accuracy of C D measurement Q Accuracy D accuracy measured D value x 100 of Q reading 1 count Note Q is the reciprocal of D Note Q aceuraey is ealeulated from the measured D value Refer to Figure 3 19 HIGH SPEED C Measurement Accuracy C Accuracy C accuracy of C D measurement Note HIGH SPEED C accuracy is specified on the ranges enclosed in the dotted line in Table A 1 Note Table A 1 is applicable under the following condition 1 Sample s D Value 0 01 C ESR G Measurement Aceuracy C Accuracy C accuracy of C D measurement ESR Aceuracy of reading ESR error in ohms number of counts see Tables A 4 and A 5 G
132. l 4277A PERFORMANCE TESTS 14 Cheek the comparison data output at the HANDLER INTERFACE connector by eomparing it with the Data States shown in Table 4 11 15 Press the ERASE key and set the following eomparator limits L C Z HIGH LIMIT BIN1 9 BIN2 11l BIN3 1 9999 D Q ESR G HIGH LIMIT el 16 Press the RUN key on the 16064A s control panel 17 Verify that the L C 1Z IN and D Q ESR G IN lamps light and 2 is displayed on the 4277A s FREQUENCY DC BIAS DISPLAY LCA FREQUENCY DC BIAS Low En HIGH O o D Q ESR G Low IN HIGH BIN NUMBER O 0 18 Check the comparison data output at the HANDLER INTERFACE connector by comparing it with the Data States shown in Table 4 11 Table 4 11 Handler Interface Output Data States TEST Connector Pin Numbers STEP 1234567689 10 19 2021 22 23 24 H H HH HH MH L Lio H HH HHH H HH L 17 H L H HH H HH H H H Approximately 5V L Approximately 0V Figure 4 8 Handler Interface Connector Pin Assignments 4 24 Model 4277A SECTION IV PERFORMANCE TESTS 4 27 HP iB INTERFACE TEST 4 28 This test verifies the instrument s HP IB capabilities Figure 4 9 HP IB interface Test Setup EQUIPMENT Personal Computer CA HP 85 1O ROM arie Taa sg yas PPC CYNY HP 00085 15003 ROM Drawer KN Nad SERR a ss HP 82936A HP IB Interface sassa s sassa ONAR HP 82937A 100pF Standar
133. le in the rear panel as shown in Figure 2 6 d 9 Thread the wires first through the teflon clamp securing the wires from A6J1 on the A6 board and then through the access hole in the rear panel 10 Reinstall the A5 board reconnect the brown 4 terminal connector to the A5 board and replace the top eover Model 4277A SECTION H Part Number Q ty Handle Kit Front Handle 5060 9900 5061 0090 Trim Strip 5020 8897 2 2 X8 32 x 3 8 Serew 2510 0195 8 9 525mm 2 5020 8863 2 2510 0193 8 9 525mm Raek Flange amp Front handle 5060 9900 2 Handle Kit Raek Mount Flange 5 5020 8875 2 5061 0084 X8 32 x 3 8 Serew 2510 0194 8 15 875mm Remove adhesive backed trim strips from side at right and left front of instrument HANDLE INSTALLATION Attach front handle 3 to sides at right and left front of instrument with serews provided and attach trim to handle RACK MOUNTING Attaeh raek mount flange 2 to sides at right and left front of instrument with serews provided HANDLE AND RACK MOUNTING Attaeh front handle 3 and rack mount flange 5 together to sides at right and left front of instrument with screws provided When rack mounting 3 and 4 above remove al four feet lift bar at inner side of foot and slide foot toward the bar Figure 2 3 Rack Mount Kit 11 Connect the pull up resistor and external voltage source as shown in Figure 2 6 a Note A 5V is recommended but higher voltage can be u
134. lue of C L or Z For example when the measured C value is 9 5nF on the 10nF range full scale factor is 0 95 Note SA SELECT SW To obtain more display digits on ranges where the number of display digits is less than 3 1 2 set the SA SELECT switch S1 on the Al logic board as shown in the figure However display fluetuation will be more than that in normal operation The setting of this switch can be changed only when the instrument is turned off Si Figure 3 4 Measurement Ranges and Number of Display Digits Sheet of 16 3 17 SECTION M Model 4277A NUMBER OF DISPLAY DIGITS FOR CAPACITANCE Test Signal Level HIGH Test Frequency Hz Capacitance l Range 100nF See Figure A F 100pF Note Shaded areas indicate that measurement cannot be performed Test Signal Level LOW Capacitance Range 10 1k to 18 1k to 20 2k to 101k to 202k to 10 9 8 Ok 19 9k 09 0k gg sk 100k 200k 1 00M 0uF See Figure B LU See Figure A See Figure B 100nF See FigureA See Figure B 4 4 3 4 3 3 10nF 5 3 3 See Figure A 4 4 3 inF 4 4 3 gt 100pF 10pF lpF Note Shaded areas indicate that measurement cannot be performed Figure 3 4 Measurement Ranges and Number of Display Digits Sheet 2 of 16 SECTION IH Model 4277A SLOW FAST
135. netions as a talker outputting data to a listener e g printer In TALK ONLY mode bit switches 1 2 and 3 determine the format in which data is output There are six formats Fl through F6 and the bit switch setting for each format is shown in Table 3 12 Refer to paragraph 3 98 for details on the output data formats Note If the instrument is set to TALK ONLY mode the Output Data Format number will be briefly displayed on DISPLAY A instead of the HP IB address when the instrument is turned on The displayed number however will be the format number plus 50 For example if the Output Data Format is F3 the number displayed on DISPLAY A at turn on will be 53 Note When the instrument is used in TALK ONLY mode devices connected to the instrument must be set to LISTEN ONLY mode Table 3 12 Output Data Formats Selectable in TALK ONLY Mode Bit witch Settings Bit 2 Bit 1 Output Data Format Fl Note Refer to paragraph 3 98 for details 3 92 REMOTE PROGRAM CODES 3 93 Remoe program codes for the 4277A are listed in Table 3 13 3 55 SECTION M DISPLAY A Function DISPLAY B Function CKT MODE MEAS SPEED Auto Range Test Signal Level Trigger Mode Zero Offset 3 56 Model 4277A Table 3 13 Remote Program Codes Sheet 1 of 2 C HIGH SPEED L HIGH SPEED C Z E 1uH 1pF 10uH 10pF 1001H 100pF 100 1mH 1inF 1009 10mH 10nF 1kQ 100mH 100nF 10kQ 1H
136. nt error code OF UF 7708 9 0 11 CF or blank is indicated on DISPLAY A or DISPLAY B value of DISPLAY A or o DISPLAY B 4 or 9 is output as Measurement cireuit mode follows G ae Status of DISPLAY A OF overflow PON 19999F 20 UF underflow ee ces 00 000E 20 3 Funetion of DISPLAY A CF change funetion a blank 449 0690982082264445 e644092 00000E 30 4 Value of DISPLAY A position of decimal point is eoineident with display Note 5 Unit of DISPLAY A DISPLAY A and DISPLAY B ranges are expressed as an exponent as follows 6 Comma data delimiter 10 p E 12 7 Status of DISPLAY B 1079 n m mHIIRRHRSee E 09 10 0 esr ss soroeseososerare sovrosesenovose E 06 8 Function of DISPLAY B 1973 m RZEPA sareng eean aana sees egre as E 03 10 taeeosooaca seooncooceconsameossceoesoo RF 00 9 Value of DISPLAY B position of decimal ig k voses oo seoosseeeeecano T 2 v E 03 point is eoincident with display 10 Unit of DISPLAY B 11 Data Terminator The data delimiter bit switeh 6 on the HP IB Control Switch is set at the 2 COMPARATOR Option 002 only faetory to comma This eauses the instrument to output all data DISPLAY X XN OO A data DISPLAY B data and if e 7 Comparator is used Comparator data MOG 4 as a continuous string When the data delimiter is set to CR
137. o Offset Adjustments Zero Offset Adjustment error The residuals of the test fixture or test leads are too high to be offset or nothing 1s connected to the UNKNOWN terminals Previous Zero Offset data are unchanged SECTION IH Model 4277A Table 3 6 Operation Error Codes Displayed on DISPLAY A B Sheet 2 of 3 Illegal LC Z RANGE DISPLAY The instrument A FREQ or TEST SIG LEVEL will automatically setting select the correct setting Illegal DC BIAS or COMPARATOR operation Internal dc bias voltage was set via the HP IB but the instrument is not equipped with Option 001 or the comparator enable code El was sent via the HP IB but the instrument is not equipped with Option 002 Install the desired option Refer to Section TI Illegal COMPARATOR operation The D Q ESR G key on the 16064A was pressed or was set via the HP IB while the DISPLAY A function was set to HIGH SPEED C HIGH SPEED L or Z D Q ESR or G comparison cannot be performed The instrument is set to HIGH SPEED L or HIGH SPEED C measurement mode Mie HELMET OFA PLAY KAE wr s Y ood c L i tt SF nb zy R p 260 f kh MP 9000 Mitt EC ets at ect O CISY T N Illegal COMPARATOR operation One of the 4277A s front r npes PTR sS panel keys except TRIGGER co BB LOCAL or DC BIAS was s pressed or was set via the
138. onnecting user fabricated test fixtures DC bias up to 40V can be applied Cable length 2m Test Fixture cable connection type for measurement of either axial or radial lead components at frequencies between 50Hz and 2MHz Three kinds of contact inserts are furnished same as those for the 16047A Test Fixture 16065A DC bias up to 200V ean be applied a protective cover provides for operator safety Cable length Approximately 40em Though z35V DC MAX is indicated on the test fixtures they are capable of handling de bias voltages up to 40V when used with the 42774A 1 26 Model 4277A SECTION II SECTION H INSTALLATION 2 1 INTRODUCTION 2 2 This section provides installation instruc tions for the Model 4277A LCZ Meter It also includes information on initial inspection and damage elaims preparation for using the 4277A and packaging storage and shipment 2 3 INITIAL INSPECTION 2 4 The 4277A LCZ Meter as shipped from the factory meets all the specifications listed in Table l l Upon receipt inspect the shipping eontainer for damage If the shipping container or cushioning material is damaged it should be kept until the contents of the shipment have been cheeked for completeness and the instrument has been checked mechanically and electrically The contents of the shipment should be as shown in Figure l l The procedures for checking the general electrical o
139. ope Bandwidth 100MHz HP 1740A A T Sensitivity 5mV DIV Oscillator Frequency 1kHz HP 652A F l Output voltage lmV Analyzer Test Cables BNC m to BNC m 61cm long 1 ea e ome n egere BNC m to BNC m 30cm long 2 ea BNC m to Dual Banana Plug 1 ea HP 11001A Dual Banana Plug to Alligator Clip 1 ea HP 11002A BNC m to Dual Alligator Clip lOcm Refer to the long 2 ea troubleshooting diagram A2 17 Alligator Clip to Alligator Clip 20cm uu T long l ea Adaptors BNC f to BNC f 5 ea HP P N 1250 0080 KM 10 1 Divider Probe HP 10004D Input impedance 10M9 1 1 probe HP 10007B HP 16048A Oscilloscope Probes P Performance Test A Adjustment T Troubleshooting SECTION IV Model 4277A Table 4 1 Recommended Equipment Sheet 2 of 2 Recommended Model Note Equipment Critical Specifications Capacitance 1pF 0 03 HP 16381A Standards 10pF 0 03 HP 16382A 100pF 0 03 HP 16383A 1000pF 0 03 HP 16384A Useable frequency Up to 1MHz Resistance 09 HP 16074A Standards 108 Standard 10082 0 03 Resistor Set 1k62 0 03 10k0 0 03 100k8 0 03 OPEN termination SHORT termination Capacitors InFt5 Resistors 4 70 5 1 4W 5600 5 1 4W 1kQ 5 1 2W 10k0 1 1 2W 100k0 1 1 8W HP IB HP 85 Controller w 00085 15003 w 82936A w 82937A P Performance Test A Adjustment T Troubleshooting Model 4277A SECTION IV SECTION IV
140. or use the instrument stands are designed to be pulled towards the front of instrument FUSE SELECTION Fuse Rating HP Part No 1 0AT 250V Slow Blow 2110 0007 0 75AT 250V Slow Blow 2110 0360 Figure 2 1 Voltage and Fuse Selection 2 2 Model 4277A United Kingdom OPTION 900 Earth PU id i Neutral Plug BS 1363A 250V Cable HP 8120 1703 OPTION 902 European Continent Earth Neutrai Plug CEE VII 250V Cable HP 8120 1692 OPTION 904 U S Canada Plug NEMA 6 15P 250V 6A Cable HP 8120 0698 OPTION 906 Switzerland Line Plug SEV 1011 1959 24507 Type 12 250V Cable HP 8120 2104 NOTE Each option number includes a family of eords and eonneetors of various materials and plug body configurations straight 90 ete SECTION II OPTION 901 Australia New Zealand Line Plug NZSS 198 AS C112 250V Cable HP 8120 0696 OPTION 903 U S Canada qc R Lu a Neutral Line Plug NEMA 5 15P 125V 15A Cable HP 8120 1521 OPTION 905 Any country Neutral Plug CEE 22 VI 250V Cable HP 8120 1860 OPTION 912 Denmark Neutral Plug DHCR 107 220V Cable HP 8120 2956 In the U S A a 230 volt mains might not include a neutral conductor In this ease it is recommended that the blue conductor of the standard power cord be connected to the terminal normally used for neutral line 1 Figure 2 2 Power Cables Supplied 2 3 SECTION H
141. ote 1 Test limits in the table do not aecount for tolerance dependent on the specified accuracy of the 5314A 2 If this test fails the instrument requires troubleshooting 4 6 Model 4277A SECTION IV PERFORMANCE TESTS 4 11 TEST SIGNAL LEVEL ACCURACY TEST 4 12 This test verifies that test signal level for the 4277A meets the specified level aceuracy of 10 iiec iu BNC to BNC Cable Figure 4 2 Test Signal Level Aceuracy Test Setup EQUIPMENT RF Voltmeter E N E A ER Ra d HP 3403C and HP 400E BNC to BNC Cable asssaicrioOR Rikoo RAR CRC ROR RZA ROS A HP 11 170A Note Use RF Voltmeter calibrated for frequency response of 10kHz to 1MHz PROCEDURE l Connect the 3403C to the 4277A UNKNOWN Hau terminal as shown in Figure 4 2 2 Set the RANGE control of the 3403C as appropriate to measure 1 Vrms 3 Set the 4277 A s controls as follows DC BIAS switeh asi ai Eda soda OFF Test FREQUENCY sesssssssossrassssasa 10kHz TEST SIG LEVEL saab ROT PTA HIGH Other controls eese rd KA Any setting 4 The 3403C should read between 0 9V and 1 1 Vrms 9 Suecessively change the test frequency setting to 100kHz and 1MHz The voltage readings on the 3403C should be within the test limits given in Table 4 3 6 Replace the 3403C with the 400E Set the TEST SIG LEVEL to LOW 7 Set the test frequency in aeeordanee with Table 4 3 Verify that the voltage readings on
142. ough shoek absorbing material 3 to 4 ineh layer around all sides of instrument to provide firm cushion and prevent movement inside eontainer Protect control panel with cardboard d Seal shipping container securely e Mark shipping container FRAGILE to ensure careful handling Model 4277A f Im any correspondence refer to instrument by model number and full serial number 2 29 OPTION INSTALLATION 2 30 Installation proeedures for DC Bias option Option 001 and Comparator Handler Interface option Option 002 are given in Figure 2 4 2 31 POWER FAILURE INSTALLATION MONITOR 2 32 To use the power failure monitor signal you must solder two wires to a jumper on the mother board remove a cap from a hole on the rear panel and bring the wires out through the hole The procedure is given below A simplified drawing of the open collector circuit a timing diagram and the locations of the jumper and hole are shown in Figure 2 6 Refer to paragraph 2 114 for a deseription of the power failure monitor signal Procedure 1 Turn off the 4277A 2 Disconnect the 4277A from the ac power source Cat e Remove the top cover 4 Diseonneet the brown 4 terminal connector from the A5 board 5 Remove the two serews that secure the A5 board to the chassis 6 Remove the A5 board 7 Solder a wire to each terminal of A6J3 The location of A6J3 is shown in Figure 2 6 e 8 Remove the cap from the access ho
143. peration are given in Section HI Paragraph 3 5 SELF TEST and the procedures for checking the 4277A LCZ Meter against its specifications are given in Section IV First do the self test If the 4277A is electrically questionable then do the Performance Tests to determine whether the 4277A has failed or not If the eontents are incomplete if there is mechanical damage or defects scratches dents broken switches ete or if the performance does not meet the self test or performance tests notify the nearest Hewlett Packard office see list at back of this manual The HP office will arrange for repair or replacement without waiting for claim settlement 2 5 PREPARATION FOR USE 2 6 POWER REQUIREMENTS 2 1 The 4277A requires a power source of 100 120 220 Volts ac 10 or 240 Volts ac 5 10 48 to 66Hz single phase power consumption is 75VA maximum WARNING IF THE INSTRUMENT IS TO BE ENERGIZED VIA AN EXTERNAL AUTOTRANSFORMER UNIT FOR VOLTAGE REDUCTION BE SURE THAT THE COMMON TERMINAL IS CONNECTED TO THE NEUTRAL POLE OF THE POWER SUPPLY 2 8 Line Voltage and Fuse Selection CAUTION BEFORE TURNING THE 4277A LINE SWITCH TO ON VERIFY THAT THE INSTRUMENT IS SET TO THE VOLTAGE OF THE POWER TO BE SUPPLIED 2 9 Figure 2 1 provides instruetions for line voltage and fuse selection The line voltage selection switch and the proper fuse are factory installed for the voltage appropriate to instrument destination CA
144. r test frequencies other than those listed above are calculated from the Zero Offset data obtained at the above test frequencies by using second degree interpolation Thus Zero Offset is provided for measurements made at all test frequencies Brief deseriptions of the Zero Offset Adjustments OPEN and SHORT are given below ZERO OPEN The procedure for performing OPEN Zero Offset Adjustment is as follows 1 Conneet the test fixture or test leads to the instrument s UNKNOWN terminals Note If test leads are used you must convert the four terminal pair configuration to a two terminal configuration Refer to paragraph 3 45 and Figure 3 8 2 Connect nothing as the DUT 3 Press the ZERO OPEN button SECTION HI When the ZERO OPEN button is pressed the instrument will be automatieally set to C G measurement mode It will then measure the test fixture s stray admittance at each of the previously mentioned test frequencies The measured values are stored in the instrument s internal memory When offset adjustment is completed DISPLAY A and DISPLAY B will be blank for l or 2 seconds after whieh the front panel controls will be reset to the settings that existed when the ZERO OPEN button was pressed The purpose of OPEN Zero Offset Adjustment is to measure the test fixture s stray admittance which as shown in Figure 3 12 a consists of Go and Co This stray admittance is equivalent to a high impedance which w
145. r to the 16064A are a trigger signal EXT TRIG that starts measurement and a key lock signal KEY LOCK that disables all control keys during comparator operation To trigger the 4277A apply a LOW signal at least 100 5 duration to the EXT TRIG line To disable the control keys of the 4277A and 16064A apply a LOW signal to the KEY LOCK line Note The INDEX and KEY LOCK signals are not mandatory for eomparator handler interface applications Note More information on the Option 002 Handler Interface is given in the 16064A Operating Note Figure 3 34 Option 002 Comparator Sheet 6 of 7 3 82 Mode 4277A SECTION M EXT TRIG To 42774 INDEX From 4277 A Data Line From 42774 EOM From 42774 KEY LOCK To 4277 A Timing Diagram Figure 3 34 Option 002 Comparator Sheet 7 of 7 Model 4277A SECTION IV Table 4 1 Recommended Equipment Sheet 1 of 2 i os Te Recommended Equipment Critical Specifications Model Note Digital Voltage range 10mV to 100Vf s HP 3478A P A T Voltmeter Resolution 0 lmVv Accuracy 0 05 Input impedance 10MQ RF Voltmeter Voltage range 10mV to 3Vrms f s HP 400E P A Bandwidth lOkHz to 1MHz and HP 3403C Accuracy 1 sa DC Power Maximum output voltage gt 50V HP 6206B Supply Resolution 100mV Frequency Counter Maximum frequency 1MHz Accuracy 0 001 Trigger level Adjustable Oscillosc
146. racy of L D measurement Note HIGH SPEED L accuracy is specified in the range enclosed in the dotted line in Table B 1 Note Table B l is applicable under the following condition 1 Sample s D Value lt 0 01 L ESR G Measurement Aeeuraey L Accuracy f L accuracy of L D measurement ESR Accuracy of reading ESR error in ohms number of counts see Tables B 4 and B 5 G Accuracy of reading G error in siemens number of counts see Tables B 4 and B 5 Note Use Table B 4 when the test frequency is 10kHz 100kHz or 1MHz Use Table B 5 for all other frequencies Note ESR range and G range depend on the selected L range and test frequency Refer to Table B 7 Note Accuracies obtained from Tables B 4 and B 5 are valid only for measurements made with the CABLE LENGTH switeh set to 0m When the CABLE LENGTH switch is set to lm add the errors listed in Table B 6 to the accuracies obtained from Tables B 4 and B 5 DISPLAY B funetion when ESR G is selected depends on the CIRCUIT MODE Model 4277A SECTION I Table 1 1 Specifications Sheet 12 of 17 Table B 4 L ESR G Aceuracies 10kHz 100kHz I MHz only Test Frequency ESR G Range lokdz 100kHz See Note H 1 50anS 40nS 5 See Note i 1 50uS 4uS 5 E Note l 1008 gt 1 05aQ2 5 Note 2 Table B 5 L ESR G Aeecuracies Test Frequency Range ESR G Range 10 1kHz to 99 5kHz 101KHz to 995kHz 100k
147. s SRQ LISTEN TALK and REMOTE indieate the status of the 4277A when it is interfaced with a controller via the HP IB The LOCAL key when pressed releases the instrument from REMOTE HP IB control and enables front panel control The LOCAL key is disabled does not funetion when the instrument is set to loeal lockout by the controller SELF TEST Key and Indicator This key initiates the instrument s SELF TEST funetion During SELF TEST when the indicator is on nine tests that eheek the basie operation of the instrument are automatically performed SELF TEST is repeated until this key is pressed again If a fault is detected an error eode will be displayed on DISPLAY A A complete description of the SELF TEST function is given in paragraph 3 5 error codes are deseribed in paragraph 3 20 4 Trigger Lamp Comes on each time the instrument is internally externally or manually triggered Trigger mode is set by the TRIGGER keys 23 8 DISPLAY A Displays measured values of inductance capacitance or impedance magnitude with a maximum 4 1 2 digits maximum display is 19999 Number of display digits depends on instrument control settings The nine LED lamps located to the right of the display are the engineering unit indicators for displayed values Measurement error messages OF UF CF operation error codes SELF TEST error codes and the instrument s HP IB address are also displayed on this display If t
148. s or Service Office for repairs 3 23 Error eodes related to operator errors are listed in Table 3 6 Corrective action for each error is also given in the table 3 24 OPERATIONAL ANNUNCIATION 3 25 On instruments equipped with Option 001 DC BIAS the annunciation shown in Table 3 5 may briefly appear on the FREQUENCY DC BIAS display after a new de bias voltage has been set It indieates that the DC BIAS ON OFF switch on the front panel is set to OFF This switeh must be set to ON if voltage from the internal de bias source is to be applied to the DUT Note For applieations using the internal de bias source the DC BIAS seleet switeh on the rear panel must be set to INT 3 11 SECTION MI Table 3 3 Error Codes for ROM RAM Self Test AlU8 ROM is faulty Ai1U9 ROM is faulty A1U10 ROM is faulty GE AlU12 RAM is faulty wi A1U12 RAM or A6BT1 is fauity Table 3 4 Error Codes for Analog Circuit Self Test Analog Circuit is not functioning properly Model 4277A Table 3 5 Operation Error Codes Displayed on FREQUENCY DC BIAS Display DISPLAY A DISPLAY B Illegal INTERNAL DC Set the DC BIAS BIAS operation Option 001 The internal dc bias voltage was set manually or via the HP IB when the DC BIAS ON OFF switch on the front panel was set to OFF any reading any reading switch to ON Note Make sure that the DC BIAS switch on the rear panel is set to INT
149. s the equivalent circuit parallel or series most appropriate for the DUT s value When LCIZ RANGE 6 is set to the 1009 range or lower circuit mode is set towe When LCIZI RANGE 6 is set to the 1kQ range or higher cireuit mode is set to ehe e we Selects equivalent series circuit M ran Seleets circuit equivalent parallel DISPLAY A Funetion Select Key and Indicators This key selects the measurement parameter for display on DISPLAY A The selected parameter is indicated by the corresponding LED lamp Pressing this key shifts the selected parameter in a top to bottom sequence The selectable parameters are as follows Measures inductance and depending on the setting of DISPLAY B Function D dissipation faetor Q quality factor or ESR G equivalent series resistance or equivalent parallel conductance Measures capacitance and depending on the setting of DISPLAY B Funetion D Dissipation factor Q quality factor or ESR G equivalent series resistance or equivalent parallel conductance HIGH SPEED L IMHz Measures only inductance at 1MHz which is set automatically when this funetion is selected HIGH SPEED C 1MHz Measures only capacitance at 1MHz which is set automatically when this function is selected 1Z 9 deg Measures impedance magnitude and phase angle The results are displayed on DISPLAY A Z and DISPLAY B 8 to provide a polar representation
150. sed as long as the current through AlT5 and A1Q4 does not exceed 25mA SECTION II Model 4277A CAUTION BEFORE PROCEEDING WITH INSTALLATION OF OPTION S TURN OFF THE INSTRUMENT AND DISCONNECT THE AC POWER CORD OPTION 001 DC BIAS SUPPLY 0 to 40V OPTION 002 COMPARATOR HANDLER INTERFACE Option Parts Board Assembly A22 04276 66522 Comparator 16064A Includes Interface Board Assembly 16064 66502 and 36 pin male Amphenol connector 1251 0084 Installation Procedure after removing top cover 1 Remove the rear panel access plate shown below 1 Remove the rear panel access plate shown Insert the interface board P N 16064 66502 into the access hole Insert the dc bias board P N 04276 66522 into the access hole 3 Insert the male edge connector of the interface board into the female edge connector of the 4277A mother board and push firmly until the interface board is completely seated 3 Insert the male edge connector of the interface board into the female edge connector of the 4277A mother board and push firmly until the interface board is completely seated 4 Reinstall the screws removed in step 1 4 Reinstaii the screws removed in step 1l Connect the 16064A keyboard cable to the connector on the interface board installed in step 3
151. sed is performed it takes some time for the voltage across sample to reach a certain percentage of the applied desired voltage Typical values of de bias voltage settling time are listed in Table 1 2 as reference data SECTION HI 3 74 EXTERNAL TRIGGERING 3 75 The 4277A ean be externally triggered by connecting an external triggering device to the EXT TRIGGER connector on the rear panel and setting the TRIGGER control on the front panel to MAN EXT on front panel The instrument is triggered measurement is made each time a positive going TTL level pulse is applied to this connector refer to Figure 3 22 External triggering ean be also done by alternately shorting and opening the center conductor of the EXT TRIGGER connector to ground chassis Vii x0 4V 2 4V lt Viy Input Levels Pulse Width Tp2100us Trigger Timing Leading Edge Figure 3 22 External Trigger Pulse 3 49 SECTION III EXTERNAL DC BIAS OPERATION lt 40V To make capacitance measurements using externally supplied de bias voltages up tp 40V connect a de voltage source to EXT INPUT INT MONITOR connector on the rear panel as shown in the diagram CAUTION DO NOT APPLY GREATER THAN t40V TO THE 4277A S EXT INPUT INT MONITOR CONNECTOR IF THE APPLIED VOLTAGE EXCEEDS 40V THE 4277A MAY BE DAMAGED CAUTION BE SURE THE CORRECT FUSE HP P N 2110 0011 IS INSTALLED IN THE DC BIAS FUSE HOLDER ON THE REAR PANEL PROCEDURE
152. sed or was set via HP IB when GF UF or CF was displayed on DISPLAY A or DISPLAY B Reset the front panel controls to the previous settings or clear the stored bin limits by pressing the ERASE button Enter LOW and HIGH limits or correct the displayed LOW and HIGH LIMITs Reset the incorrect parameter Turn off the instrument and set the HP IB address to one between 0 00000 and 30 11110 Only valid refer ence values can be used for deviation measurement SECTION M 3 26 TEST FREQUENCY 3 27 There are six test frequency ranges as listed in Table 3 7 Frequency accuracy is 0 01 of the value displayed on the FREQUENCY DC BIAS display Table 3 7 Test Frequeney Resolution Ranges and Resolution 10 0kHz 20 0kHz 100Hz 20 0kHz 50 0kHz 200Hz 50 0kHz 100kHz 500Hz 100kHz 200kHz 1kHz 200kHz 500kHz 2kHz SO0kHz 1 00MHz 5kHz lest Frequency Range r 3 28 TEST SIGNAL LEVEL 3 29 The 4277A has two test signal levels HIGH 1Vrms and LOW 20mVrms Aceuracy for each level is listed in Table 3 8 The output impedance of the test signal source is 1608 10 so the voltage across the DUT depends on the DUT s impedanee Refer to Figure 3 3 HIGH LOW Select ZL 100 Zr Vosc Model 4277A Table 3 8 Test Signal Level Aceuracy Other Frequencies 3 30 MEASUREMENT RANGE 3 31 Measurement range depends on the test frequency Th
153. set values are displayed on both DISPLAY A and B 4 The values displayed on the 4277A should be within the following test limits DISPLAY A 0 0 0008nF DISPLAY B 0 0 07 8 5 Set the TEST SIG LEVEL and test frequeney in aeeordanee with Table 4 6 a The values displayed on the 4277A should be within the test limits given in the table 4 11 SECTION IV Model 4277A PERFORMANCE TESTS lnn 10 Connect Short termination direetly to 4277A UNKNOWN terminals as shown in Figure 4 6 b Press the ZERO SHORT button and wait a few seconds Set the 4277A s controls as follows DISPLAY A function scivsisscocesvescace Gosi Bi DISPLAY B function sea aaee XKR ESR G Pest Preguency icsacassessacesdsechseadaseesavres eno LOKHZ L RZNOB wie a winters sudeeesoascevedeccseces imH TEST SIG LEVEE 5iu satvedecsvordisesdeleatecetctiers HIGH The values displayed on the 4277A should be within the following test limits DISPLAY A 0 0 0009mH DISPLAY B 0 0 058 Suceessively set the TEST SIG LEVEL test frequency and LC Z RANGE in accordance with Table 4 6 b The values displayed on the 4277A should be within the test limits given in the table Table 4 6 a Open Short Tests Open Test Frequency TEST SIG LEVEL HIGH DISPLAY A DISPLAY B DISPLAY B l0kHz 0008nF 0 0 07u8 0016nF t0 14uS 20kHz 0013nF 040 111S 0 012nF LU 22s 20 2kHz 0017nF 0 0 0008mS 012nF 0016mS 50 5kHz 00linF 040 0008mS O11InF
154. sponds to the ratio of the distance between the two points to the wavelength of the propagating signal Consequently owing to their length test cables used to connect a sample to the UNKNOWN terminals will eause a phase shift and a propagation loss of the test signal For example the wavelength of a 1MHz test signal is 300 meters which is 300 times as long as the Im standard test cables Here the phase of the test signal at the end of the test cable will be shifted by about 1 2 degrees 360 300 in reference to the phase at the other end of the cable Since the effect of test cables on measurements and the resultant measurement error increase in proportion to the test frequency cable length must be taken into consideration when making high frequency measurements The CABLE LENGTH switch must be selected so as to provide the correet phase compensation for measurements made with the Im standard test cables or for a test fixture attached directly to the UNKNOWN terminals When standard test cables 1m or 2m are used the CABLE LENGTH switch must be set to the Im position to minimize additional measurement errors The 0 position is for direct attachment type test fixtures Model 4277A Tesi Coble a L 82 Weve length A 062 801 radion trad 57 2958 2X 4 x Figure 3 10 Test Signal Phase on Test Cables Note When the HP 16065A EXT Voltage Bias Fixture is used with the 4277A set the CABLE LENGTH switch
155. ssories This seetion covers specifications instrument identification description options accessories and other basie information 1 3 Listed on the title page of this manual is a mierofiche part number This number can be used to order 4x6 inch microfilm transparencies of the manual Each microfiche contains up to 60 photo duplicates of the manual pages The mierofiche package also includes the latest manual changes supplement as well as all pertinent serviee notes To order an additional manual use the part number listed on the title page of this manual 16047A 1 4 DESCRIPTION 1 5 The HP Model 4277A LCZ Meter is a fully automatie high performance test instrument designed to measure the inductance capacitance dissipation factor quality factor eonduetanee equivalent series resistance impedance magnitude and phase of electronie eomponents and devices Its built in test signal source covers the frequency range of 10kHz to 1MHz and provides 701 spot frequencies Test frequeney resolution is 100Hz maximum and frequency aceuracy is 0 01 of the selected spot frequency Frequently used spot frequeneies 10kHz 100kHz and 1MHz ean be quiekly selected by the SPOT key Test signal level is selectable at 1Vrms HIGH or 20mVrms LOW The instrument s state of the art 4 terminal pair configuration provides a basie measurement aceuracy of 0 1 over a wide measurement range P N 8120 1378 Figure 1 1 Mod
156. t sections 1 Range Resistors 2 Process Amplifier 3 Bridge Balanee Control 4 Phase Detector 5 A D Analog to Digital Converter AD Conver ter Range Resistor LCUR Phase Det ctor 4277A Measurement Section CAPACITANCE ACCURACY TEST verifies Range Resistor accuracy for reactive impedance measurements from the lowest through the highest test frequencies Balanee Control linearity and normal operation of the Phase Detector and A D Converter are also verified RESISTANCE ACCURACY TEST is similar to the Capacitance Accuracy test but for resistive impedance measurements Thus accuracy for both reactive and resistive components of the veetor impedance is verified SELF OPERATING TEST verifies the accuracy of the Process Amplifier which extends the measurement ranges The A D Converter accuracy is also checked by this combined self test function which enables automatie check of each one of these circuits PHASE ACCURACY TEST verifies phase flatness characteristics minimum phase shift of the overall measurement section and Phase Detector phase accuracy from the lowest through the highest test frequencies Note A set of detection phases each different by 90 degrees is used in the Phase Detector If the relative phase difference between the detection phases is exactly 90 degrees the Phase Detector is operated at the maximum detection accuracy The aecuracy of the right angle detection phases is verified by
157. tance of this component decreases while the resistive factor loss increases At the resonant frequency fo this component is purely resistive The effective resistance increases at resonance even if the inductor has no resistance ideal induetor at de Consequently the loss factor varies sharply at frequencies around the resonant point fil f2 lt fo lt fa fa Figure 3 18 Typical Impedance Locus of an Inductor 3 43 SECTION H 3 60 DEVIATION MEASUREMENT FUNCTION 3 61 When many components of similar value are to be tested it may be more practical to measure the difference between the value of the component and a predetermined or ideal reference value than measuring the DUT value itself When the purpose of the measurement is to observe the change of a component s value versus changes in temperature frequency bias ete a direet measurement of this change deviation makes examination more meaningful and easier 3 62 When the A key is pressed the values measurement results displayed on DISPLAY A and DISPLAY B are stored in the instrument s memory and are then used as the reference values for all subsequent measurements The value displayed on each display is not the sample s measured value it is the difference between the stored reference value and the measured value Stored reference values are maintained by the 4277A s continuous memory funetion when the instrument is turned off The deviation measurement f
158. tance value of DUT f is test frequeney Xm is measured reaetance value of DUT As stated above each measurement parameter is interrelated with the impedance or admittanee value consequently the aceuracies on all ranges can be verified if the instrument satisfies specified aceuracies for each one of its resistive and reactive measurement parameters that is resistance and capacitance from the lowest through the highest test frequencies The technician should note that aceuracy here is based on arithmetic relationships as are the parameter relationships Therefore the accuracy tests ean be done by simplified procedures instead of time consuming tests on the approximately 250000 possible eombinations of the fundamental test parameters such as measurement parameter frequeney and range Verifieation Cheek Considerations The measurement accuracy test can be made by using ealibrated standards on specifie ranges only On other ranges which would be uncertifiable because of the limitations of the standards the test takes the method proven to be theoretieally and experimentally practicable for verifieation of accuracy If the results of these cheeks meet all the individual test limits the instrument should satisfy its specified aceuraey aeross its entire range How then ean these methods be explained Let us look at the performance test articles Model 4277 A Model 4277A Accuracy test procedures include checks for the following circui
159. testing and ten bin sorting The handler interface is for eontrol of an automatie eomponent handler 3 115 Up to nine sets of high low limits for L C or Z measurement and one set of high low limits for D Q ESR or G measurement can be keyed in from the 16064A keyboard or entered via the HP IB When measurement is made the comparator eompares the measured values displayed on DISPLAY A and DISPLAY B with the stored high low limits If the measured values fit any set of limits the bin number for that set is displayed on the FREQUENCY DC BIAS display If the measured values do not fit any of the limits zero 0 the number for the out of limits bin is displayed Go no go decisions are indicated by two sets of LOW IN HIGH LED lamps on the 16064A keyboard Comparator Handler Interface operation is described in Figures 3 34 Signal Name DQIN DQLO KEY LOCK se EXT DCV1 EXT TRIG EXT TRIG EXT DCV 2 EXT DCV COM EXT DCV 2 EXT DCV COM 45V GROUND GROUND GROUND Externally Applied Signals Model 4277A 3 116 The 16064A has a 36 pin female Amphenol connector for interfacing with an automatic component handler The 16064A sends comparison results LOW IN HIGH decisions and bin number to the handler and receives control signals via a user fabricated interface cable construeted using the furnished 36 pin male Amphenol connector P N 1251 0084 Pin assignments are given in Figure 3 33 For eomplete
160. the 400E meet the test limits given in the table Table 4 3 Test Signal Level Accuracy Test Equipment High 1Vrms 0 9 to 1 lVrms 0 9 to l iVrms 0 9 to 1 lVrms HP 3403C Low 20mVrms 17 to 23mVrms 17 to 23mVrms 18 to 22mVrms HP 400E SECTION IV Model 4277A PERFORMANCE TESTS SEERA NSE ENCE TA zza M Cze O EEE CH MO Cz den ESC 4 13 SELF OPERATING TEST 4 14 The self operating test cheeks operating conditions of the circuits which are eritieal to maintaining the specified accuracies To verify that these circuits satisfy the performance requirements for ensuring specified accuracies the values displayed in the Self Test are compared with test limits Because basie circuit operating conditions related to accuracy are verified in this test the instrument should be initially checked with this test id eA CON EN ASR Eere En the sas Pues SM n pith ds NA 3E mei i E L En v A Qo 89 a A ze o Standard 2 sa Standard L E AMEN Capacitor qe mee a b Figure 4 3 Self Operating Test Setup EQUIPMENT Standard Capacitors esas saos rnar nasse n ns ee LOPF HP 16382A 100pF HP 16383A 1000pF HP 16384A Standard Resistor ess sssassassestesacseyosssesosesoesose 1009 HP 16074A Standard Termination dc R Ya TENS APNEA Open 0S j Resistor Set PROCEDURE l Connect Open 0S termination directly to the 4277A UNKNOWN terminals as shown in Figure 4 3 a
161. the DUT 4 Perform OPEN and SHORT Zero Offset return to QV adjustments as deseribed in paragraph 3 51 14 Remove the DUT from the test fixture Set the instrument s front panel controls Note as appropriate for the desired measurement Press the FREQ DC BIAS seleet key 2 The DC BIAS lamp will come on Set the desired voltage by pressing the appropriate FREQ DC BIAS control key A The voltage value will be displayed on the FREQUENCY DC BIAS disp ay Note OFF will be briefly displayed on the FREQUENCY DC BIAS display when the FREQ DC BIAS control key is released switch is set to OFF if the DC BIAS ON OFF Connect the DUT to the test fixture CAUTION DO NOT CONNECT A CHARGED DUT TO THE TEST FIXTURE DOING SO MAY DAMAGE THE INSTRUMENT For reasons of safety and measurement accuracy the voltage actually applied to the DUT should be monitored Refer to Figure 3 32 Note When the DC BIAS switch on the front panel has been set to ON and the desired bias voltage is entered the instrument automatically takes a wait seconds before outputting the bias voltage after completion of the bias data input Aceordingly it takes approximately 0 8 seconds bias settling time for the bias voltage to be applied to the DUT as well as to be settled after the bias data has been set For the bias settling time refer to Table 1 2 Supplemental Performance Characteristics time of approximately 0 8 Figure 3 31
162. the self test funetion and read the measured value and unit indieator Thereafter reset the self test funetion and select the test item 3 The value displayed on DISPLAY A should be between 0 and 200 counts Repeat steps 15 16 and 17 with the 100pF and 1000pF standard capacitors Set the range step 16 as listed in Table 4 5 Table 4 5 Self Operating Test Item 3 mea eo Note Only self test items 3 8 and 9 are used in this test Model 4277A SECTION IV PERFORMANCE TESTS 4 15 OPEN SHORT TEST 4 18 This test cheeks that the Zero Offset function is operating correctly 9 Figure 4 4 Open Short Test Setups EQUIPMENT Terminations sereno noo Open 0S HP 16074A Short Standard Resistor Set PROCEDURE 1 Connect Open 0S termination directly to the 4277A UNKNOWN terminals as shown in Figure 4 4 a 2 Set the 427 A s controls as follows DISPLAY A funetion enr ZA e DISPLAY B function iae ette eoe ESR G Test Frequency seves sss ess eene neenon sooner etant 10kHz C RANGE erre EEEE sesecehteens InF TEST SIG LEVEL czas RPP SY Per HIGH CIRCUIT MODE uwaa vatusackakauuxo vba AUTO MEAS SPEED essa esans ass s Va RZ aeS e MED TRIGGER wii i c E RTA cocesceketeetocnapsads INT CABLE LENGTH SWIteh uuiescsexespesssucvausups 0 DC BIAS switch sss ssa een een aene no DNEM OFE 3 Press the ZERO OPEN button to perform open offset adjustment and wait approximately 10 seconds Off
163. tion 002 Comparator Handler Interface Note The above option code will not be displayed if the 16064A Comparator Handler Interface is not conneeted to the instrument The following option eode is displayed on the FREQUENCY DC BIAS display if the instrument is equipped with Option 001 Internal DC Bias FREQUENCY DC BIAS I d 155 3 LC 4 BIEG a 0 OF of 3 37 After the HP IB address and option codes have been displayed the continuous memory funetion automatically recalls the front panel control settings that existed when the instrument was turned off 3 36 Model 4277A Note Output from the internal de bias source option 001 instruments is automatically set to OV at instrument power on as a safety precaution 3 38 INITIAL CONTROL SETTINGS 3 39 The 4277A is automatically set to the eontrol settings listed below when the continuous memory funetion refer to paragraph 3 40 is reset as deseribed in paragraph 3 43 DISPLAY A Function 777 gt DISPLAY B Function eer G CIRCUIT MODE ront AUTO LC 127 RANG oessa essmonosescocceve A TITO MEASUREMENT SPEED MED TEST SIGNAL LEVEL HIGH TRIGGER 7 rre EPA INT SELF TEST eere eee ehe grana 4 0000 OFF OO RYTY Kaa N RN SRN vg e OFF FREQ DC BlASeesrsesescccccessccecaes FREQ SPOT COARSE FINE HR SPOT Frequeney ecesscecsescaeoes esecsececececes 1 OOKHZ OPEN ZERO DATA s sssresosesssoese 09 SHORT ZERO DATA 0S8
164. tions except power on off and DC BIAS ON OFF ean be remotely controlled from an HP IB compatible controller When set to TALK ONLY mode the 4277A ean send measurement data to an external device a printer for example without a controller 1 9 The 4277A ean be equipped with two special options Option 001 Internal DC Bias and Option 002 Comparator Handler Interface Refer to paragraph 1 21 for a brief deseription of these options 1 10 A wide selection of aecessories test fixtures and test leads is avaialable All accessories are useable with HP s other four terminal pair type instruments A deseription of furnished accessories is given in paragraph 1 30 For details on available accessories refer to paragraph 1 32 1 2 Model 4277A l 11 SPECIFICATIONS 1 12 Complete specifications of the Model 4277A are given in Table l l These specifications are the performance standards or limits against which the instrument is tested The test procedures for verifying the specifications are covered in Section IV Performance Tests Table 1 2 lilsts supplemental performance characteristics Supplemental performance characteristics are not specifications but are typical characteristics ineluded as additional information for the operator When the 4277A is shipped from the factory it meets the specifications listed in Table 1 1 1 13 SAFETY CONSIDERATIONS 1 14 The Model 4277A has been designed to eonform to the safety r
165. to 10 085V 12 538V to 12 862V 39 765V to 40 235V 39 565V to 40 435V 4 21 SECTION IV Model 4277A PERFORMANCE TESTS 4 25 16064A COMPARATOR HANDLER INTERFACE TEST OPTION 002 4 26 This test verifies the funetions of the 16064A Comparator Handler Interface dg 160644 COMPARATOR HANDLER INTERFACE H WLET PACKARS COMPARATOR Wes II f ENABLE LEII ERG Low I HIGH 000 D Q ESR G BANDLER INTERFACE LOW IN HIGH O Figure 4 7 16064A Comparator Handler Interface EQUIPMENT Digital Multimeter 22 ers ada T HP 3478A 100k Standard resistor eene R HP 160744 1000pF Standard capacitor Ax eee v I ide Mis HP 16384A PROCEDURE Set jumpers Al W1 W2 W3 in the 16064A to the lower position as shown below I6064A Al Board Upper Position Lower Position O L E Z w2 W3 2 Conneet the 16064A to the COMPARATOR HANDLER INTERFACE conneetor on the rear panel of the 4277A 3 Turn on the 4277A 16064 should be displayed on DISPLAY B 4 Set the 4277A s controls as follows DISPLAY A B functions sss sss ess sesa aana anns s C G Test Frequency 02 200000 00400004000000400000 sadzac LOOK NZ DO BIAS ASA agaver TR OCZ OFF CKT MODE sssssssoososeosos dices S AXUAXE TRU KET LOTZI RANGE aukceivestere e IDE MEAS SPEED 2 2200020 40022000000000000000 zaw MED TEST SIG LEVEL sess aec coupe geat sre HIGH
166. trol Keys to FREQUENCY control mode or DC BIAS control mode The seleeted eontrol mode is indieated by the corresponding LED lamp FREQ When this LED lamp is on frequeney is displayed on the FREQUENCY DC BIAS Display and is controlled by the SPOT COARSE FINE Key and the FREQUENCY DC BIAS Step Control Keys DC BIAS When this LED lamp is on DC bias voltage is displayed on the FREQUENCY DC BIAS Display and is controlled by the FREQUENCY DC BIAS Step Control Keys FREQUENCY eontrol mode and DC BIAS control mode are mutually exelusive and DC BIAS ean be seleeted only if the instrument is equipped with Option 001 Figure 3 1 Front Panel Features Sheet 2 of 6 SECTION M Model 4277A 0977A Lez METEA j EE ate N i EJ UNE CABLE 7 EKT MODE AGIZ RANGE TAIGGEA n ENGTK tas VEL Agfa ne E AUTO MANUAL js CAE men SKT MANY oG0606 i O Beg L 0 SPOT COARSE FINE Select Key and Indicators This key selects the SPOT COARSE or FINE vernier mode for frequency changes mode by the FREQUENCY DC BIAS Step Control Keys The selected vernier mode is indieated by the eorresponding LED lamp Frequencies possible in each vernier mode are listed below SPOT 10KkHz 100k Hz I MHZ COARSE 10kHz to 100kHz in 10kHz Steps 100kHz to 1MHz in 100kHz steps FINE 10kHz to 20kHz in 100Hz steps 20kHz to 50kHz in 200Hz steps 50kHz to 100kHz in
167. uipped with the Comparator Handler Interface option Option 002 all high and low limits and all 16064A control settings except RUN are memorized DC bias voltage Option 001 settings however are not memorized 3 43 RESETTING CONTINUOUS MEMORY 3 44 To reset or clear continuous memory proceed as follows 1 Turn off the 4277A 2 Press and hold both FREQ DC BIAS Step Control Keys 9 3 Turn on the 42774 3 45 UNKNOWN TERMINALS 3 46 Generally the mutual induetanee between test leads noise from nearby equipment and the residuals and strays of conventional connection methods significantly affect the aceuracy of impedance measurements made at high frequencies To minimize these error sources and thereby ensure optimum measurement accuracy the 4277A employs a four terminal pair connection method The UNKNOWN terminals consist of four BNC female connectors Hoer high current Hor high potential L por low potential and Leu low current The current terminals Hon and Leur provide the test signal eurrent and the potential terminals Hpor and Leo detect the voltage across the DUT device under test To connect a sample the four terminal pair configuration must be converted to a two terminal configuration This is done by connecting the outer conductors of the terminals to each other and then Hcur to Hpor and Leus to Leor as shown in Figure 3 8 The principle of the four terminal pair measur
168. unction is automatically turned off when the DISPLAY A function DISPLAY B function LC Z RANGE or CKT MODE is changed It may be turned off also if the test frequency is changed when the DISPLAY B funetion is ESR G because the measurement range for ESR and G is frequency dependent Model 4277A 3 63 CHARACTERISTICS OF TEST FIXTURES 3 64 Characteristics and applicable measurement ranges of the HP test fixtures and test leads for the 4277A are summarized in Table 3 10 To facilitate measurement and to minimize measurement errors a test fixture appropriate for the measurement should be chosen from among HP s standard accessories Select the test fixture or leads that have the desired performance characteristics Table 3 10 Typical Charaeteristies of Test Fixtures and Leads Parameter Value Frequency 16047A Full range Full range 16047C Full range 16048A 16048D Full range Fuil range Ranges satisfied z gt 50Q 16034B Full range 3 44 Applicable Measurement Ranges Model Measurement Parameter Reading Error D Offset Value 16048B Full range C gt 1000pF Below 100kHz mn S 50Hz Reading Error at 1MHz Residual Parameter Values C lt 5pF L 200nH R lt 10mQ Residual Parameter Values C lt 0 02pF L 30nH R 50mQ Model 4277A 3 65 MEASUREMENT ACCURACY 3 66 The measurement reference plane for the accuracies specified in Seet
169. w m et c Measurement Time ms 0 10K 20K 100K IM Test Frequency Hz Measurement Speed Mode Measurement Function Model 4277A 1 30 ACCESSORIES SUPPLIED 1 31 The standard HP Model 4277A LCZ Meter along with its furnished accessories is shown in Figure l l The furnished accessories are also listed below 16047A Test Fixture Refer to Table 1 3 for a brief deseription Power Cable e HP Part No 8120 1378 Fuse esec ZE HP Part No 2110 0007 or 2110 0360 SECTION I 1 32 ACCESSORIES AVAILABLE 1 33 In addition to the furnished 16047A Test Fixture seven special purpose test fixtures and test leads are available Each is intended for a particular measurement or DUT type and all were designed with careful consideration to accuracy reliability ease of use and compatibility with other HP instruments A brief description of each available accessory is given in Table 1 3 1 23 SECTION I Model 4277A Table 1 3 Accessories Available Sheet 1 of 3 Test Fixture direct attachment type for measurement of either axial or radial lead components Three kinds of contact inserts are furnished 1 604 A furnished D For axial lead components HP P N 16061 70022 2 For general radial lead components HP P N 16061 70021 3 For radial short lead components HP P N 16047 65001 DC bias up to 40V ean be applied Test Fixture d
170. x 100 of G reading ESR accuracy measured ESR x 100 of G reading 1 count Note 3 Tables A 4 and A 5 are applicable under the following conditions 1 CABLE LENGTH 0m 2 Test Signal Level HIGH 1Vrms 3 Sample s D Value 0 1 4 Zero offset adjustment has been performed with the OPEN and SHORT terminations of the Model 160744 Note 4 Error doubles when LOW test signal level 20mVrms is used Note 1 Table A 6 is applicable under the following conditions 1 Test Frequency 1MHz CABLE LENGTH Im 3 Test Signal Level HIGH 1 Vrms Sample s D Value lt 0 1 Test Lead Model 16048A or 160485 Zero offset adjustment has been performed with the OPEN and SHORT terminations of the Model 16074A Error doubles when LOW test signal level 20mVrms is used Note 2 Model 4277A SECTION I Table 1 1 Specifications Sheet 8 of 17 Table A 7 ESR G Range Selection Capacitance Test Frequency Range 10kHz to 20kHzi20 2kHz to 200kHzi202kHz to 1MHz LK 10mS 10k imS 100k 100u SECTION I Model 4277A Table 1 1 Specifications Sheet 9 of 17 Inductance Measurement Accuracy L D Measurement Accuracy L Accuracy of reading L error number of eounts see Tables B l and B 2 D Accuracy of reading D error number of counts see Tables B l and B 2 Note Use Table B 1 when the test frequency is 10kHz 100kHz or IMHz Use Tables B 2 for all other frequenc

HP 4277a User's Manual

Contents

Download Pdf Manuals

Related Search

Related Contents