Home

Agilent Technologies 8510C User's Manual

1. El CENTER 4 000000000 GHz SPAN 5 2062500900 GHz Store to Disc is used to select data output to or retrieval from a disc mass storage device Press DISC then STORAGE IS INTERNAL to select the front panel disc drive or STORAGE IS EXTERNAL to select a disc drive on the HP 8510 System Bus To initialize the disc press SET UP DISC then choose either INITIALIZE DOS DISC or INITIALIZE LIF DISC The term DOS refers to the Disc Operating System format used by most personal computers using the MS DOS operating system The HP 8510 can only initialize using DOS format on the Internal disc drive The term LIF refers to the Logical Interchange Format which is the standard disc format used by HP Series 200 300 computers After making this selection press either INIT DOS YES or INIT LIF YES to start the disc initialization process The HP 8510 can store files to and load files from any standard DOS or LIF format disc on either the internal or external drive To determine whether the HP 8510 can use a disc not initialized by the HP 8510 install the disc in the internal or external drive select STORAGE IS INTERNAL or STORAGE IS EXTERNAL then press DIRECTORY A complete directory will appear Press STORE and specify the type of file to be recorded then enter the file name and store the file To load pre viously recorded data from storage into HP 8510 memory press
2. CENTER 7 000000000 GHz SPAN 4 000000000 GHz Passband Flatness S21 log MAG REF 0 341 4B L 0 2 dB V 0 3403 d8 ha T T T 2 pe qtv a Pas T f 1 EAEE START 5 950569650 GHz STOP B 053930000 GHz Measuring Insertion Phase 1 100 0 V 55 088 Fp J pr i aie i MARKER 1 a 00p249825 GHz ie PAPIE CET OES Ly ny de Beaks T 1 las AAA START 5 950563650 GHz STOP 8 053930008 GHz 23 The marker search functions can be used to read the 3 dB bandwidth as follows STIMULUS MORE HOLD MARKER 1 MORE MARKER to MAXIMUM PRIOR_MENU MARKER 2 MORE MARKER to MAXIMUM PRIOR MENU A MODE MENU A REF 1 MORE TARGET VALUE MARKER to TARGET PRIOR MENU MARKER 1 MORE SEARCH LEFT PRIOR MENU MARKER 2 The markers are now at the 3 dB frequencies and the 3 dB bandwidth is displayed in the active function area The wide dynamic range of the HP 8510 allows it to measure stopband rejection over 100 dB below the passband response Maximum dynamic range requires proper selection of input power level MARKER 1 MORE MARKER to MAXIMUM A MODE MENU A REF 1 MARKER 2 MORE MARKER to MINIMUM The marker automatically moves to the minimum point on the trace The marker value shows the difference betwe
3. START 0 245220002 GHz STOP SO 220220002 GHz In the split display the parameters are eye in the same relative position as the ARAMETER keys To change the FORMAT and RESPONSE settings for an individual parameter first press a PARAMETER key then change the FORMAT and or RESPONSE settings 2 log MAG REF 50 0 dB 10 0 d4B 0 4112 dB m AA START STOP S 250000008 GHz 13 725020000 GHz 31 Chapter 5 Measurement Enhancements The HP 8510 network analyzer provides many features that add to convenience and accuracy These paragraphs describe the single and dual channel display modes The versatility of the single and dual channel modes of the HP 8510C gives the user many choices for the display of the measured data The HP 8510 uses two identical independent measurement channels to acquire and display data The instrument can operate in either a single channel or a dual channel data acquisition and display mode Single Channel Single Parameter In the Single Channel mode either a single parameter or all four of the basic S parameters can be selected for display Preset selects the single channel single parameter display Single Channel Four Parameter To choose the four parameter display press DISPLAY MODE FOUR PARAM OVERLAY or FOUR PARAM SPLIT Now all four of the basic parameters S S217 S12 and S of the current chan
4. START 5 950569650 GHz STOP 8 053930000 GHz Measuring Phase Distortion The HP 8510 electronically implements a function similar to the mechanical line stretcher of earlier analyzers This feature simulates a variable length lossless transmission line which is effectively added to or removed from the reference signal path to compensate for electrical length in the test signal path As shown in this example of measurements on a length of coaxial cable this feature can be used to easily determine the electrical length of the test device After measurement calibration insert the test device a cable in this example and select PHASE Place the marker at an appropriate point on the trace usu ally the center of the frequency span Press RESPONSE MENU then AUTO DELAY The HP 8510 automatically adds the electrical delay necessary to flatten the phase response at the marker position Press ELECTRICAL DELAY then use the knob or numeric entry to add or sub tract electrical delay with the objective of flattening the trace to zero degrees over the frequency range of interest When the phase trace is flat the active function shows the elec trical length of the test device relative to the speed of light in free space Thus the physical length of the device is related to this value by the propagation velocity in the medium of the device For many networks the amount of insertion phase is not nearly as important as th
5. Each parameter can have a different Response Cal Set The frequency response calibration removes the magnitude and phase frequency response errors of the selected signal path by normalizing the response of the device under test to the ideal response of the selected calibration standard For S and S measurements the thru connection is sub stituted for the DUT to establish a 0 dB and 0 degrees reference The thru connection is accomplished by connect ing together the points at which the DUT will be connected For S and S measurements either a short circuit or an open circuit is connected to the point at which the DUT will be connected to establish the reference response REFLECTION SELECT ONE TOL TRANSMISSION CORRECTION 2 0N OFF CAL 1 3 5 mm 8 1 SELECT CAL SET even ke TO RECEIVE gt RESUME CAL SEQUENCE MORE Fortunately it is relatively easy to evaluate the general validity of the calibration To test repeatability remeasure one of the calibration standards If you cannot obtain repeatable measure ments from your calibration standards maintenance needs to be performed on the test port connectors or cables Also main tain at least one sample of the device under test as your refer ence device After calibration measure this reference device and note its responses Periodically remeasure this device and note any changes in its corrected response which can be attributed to the test syste
6. The reader who has limited prior experience with network analysis techniques or the HP 8510 will find Chapter 1 helpful It overviews the system hardware then presents a general procedure for making network measurements using the HP 8510 This procedure is followed throughout the rest of the guide These chapters illustrate the HP 8510 at work making a variety of reflection and transmission measurements The examples have been chosen to demonstrate many of the operating modes for the instrument The examples should help you adapt these techniques to measurement of your particular device The HP 8510 can optionally present measured data in the Time Domain This valuable feature permits analysis of impedance and length characteristics of a signal path with respect to time or distance This chapter Measurement Enhancements describes addi tional features of the HP 8510 that you can use to make the measurement easier and more productive Other HP 8510 Learning Products The HP 8510 Operating and Programming Manual has more complete operating information for both manual and auto matic measurements Refer there for further information on any topic in this User s Guide as well as topics not described here It is assumed that the network analyzer system is installed and ready for use If not refer to the Installation manual for installation and checkout instructions The Service manual contains specifications replaceable parts lists and
7. 16 Step 8 Output Measurement Results Measurement results can be output to a graphics printer copy gt gt COPY MENU PLOT TO PRINTER P OT TO PLOTTER UST TRACE VALUES SYS OPER PARAMETERS DEFINE PRINT DEFINE PLOT DEFINE usT ABORT PRINT PLOT DEFINE PRINT MENU AUTO FEED ON OFF FORM FEED MORE DEFINE PLOT MENU PLOT TYPE MONOCHROME COLOR SET PEN NUMBERS DEFAULT PEN NUMBRS AUTO FEED ON OFF DEFINE UST MENU UST SKIP FACTOR AUTO FEED ON OFF FORM FEED 17 digital plotter or a line printer using using selections in the menu structure The HP 8510C adds two RS 232 ports for connection of hardcopy output devices Moving the output devices from the 8510 system bus to the RS 232 ports may improve measurement throughput because since the RS 232 ports are fully buffered the measurement can continue while the plot is being produced Use the menus to store the actual measured data to the front panel disk or to a disk type mass storage unit on the 8510 system bus Select Graphics or List The selections allow choice of plots to a graphics printer or to a digital plotter or output a tabular list of trace values to a line printer Pressing PLOT TO PRINTER PLOT TO PLOTTER or LIST TRACE VALUES outputs the current measurement data to the selected device according to the output definition The sys tem and operating parameters are lists descri
8. If the device is a one port device connect the DUT directly to the test port using an adapter if required If the device has two or more ports either use the two test port extension cables and the necessary adapters to achieve a symmetrical setup or connect the DUT directly to Port 1 and use a single cable to connect Port 2 of the device to test set Port 2 In order to minimize the connect disconnect cycles on the rel atively expensive test set or cable connectors it is always good practice to use a consumable high quality adapter or connec tor saver Connect this connector saver to the test setup before doing the measurement calibration Step 3 System Control Settings Use the STIMULUS PARAMETER FORMAT and log MAG MARIKER ES 99 _GHa point 139 SENTER 35 110200200 GHz STIMULUS w log MAG nee 12 E Ta 5 0 5 AAAAGAAAD GHz POWER MENU SWEEP TIME NUMBER of POINTS FREQUENCY UST TRIGGER MODE EDIT UST COUPLED CHANNELS UNCOUPLED CHANNELS 1 V_ 27 323 on B 7 bo SEGMENT q 3 i SINGLE BEG CENTER GHz SPAN GHz pe GHZ SEGMENT t BS 114002242 P RS 1180007 op 6 0WI0ADAA asaggoga ALL 3 00024200 E SEGMENTS NUMBER OF adr PDINTS ET 35 112200000 GHz BADOOAAZO GHZ 11 01 03 31 OCT Q RESPONSE controls t
9. Ni i K p Entry Area Terminators Key Power Name Frequency Power Slope Time Voltage G n GHz ns M p MHz us uV k m kHz ms mV x1 Hz dBm dB GHz s V Always Basic Units for Current Active Function CHANNEL y DOMAIN y PARAMETER y FORMAT RESPONSE STIMULUS MENU STRUCTURE POWER MENU POWER SOURCE 1 SWEEP POWER TIME SOURCE 2 NUMBER of POWER POINTS SLOPE FREQUENCY usT Hoto SINGLE SINGLE ATTENUATOR NUMBER of PORT 1 GROUPS 2 CONTINUAL TRIGGER MODE EDIT UST COUPLED CHANNELS UNCOUPLED RETURNS TO CHANNELS PRIOR NEXT HIGHEST LEVEL MENU Turn on System Power P F R Memory This diagram shows that the HP 8510 internal memory provides what is called the Channel Domain P F R Limited Instrument State Functionally this feature allows you to select the format and response settings most appropriate for viewing the parameter then when you switch between the different parameters the previous format and response settings are automatically recalled Active Function Pressing one of the function keys in these groups either changes the instrument state immediately such as selecting one of the parameters or for keys such as START makes that function the active function and its current value is shown in a specific area of the CRT I Active 1 START 1 Function gt j 45 0 MHz l Softkey Menus Cho
10. sistency the SMITH format uses Polar conventions For an example showing linkage of the Channel Param eter and Format keys select CHANNEL 1 S11 LOG MAG AUTO MARKER REF_VALUE MARKER Go Switch between Channel 1 and Channel 2 and between parameters and formats on both channels to learn about this Channel Domain P F R association Of course all settings are saved when you use the save instrument state function 10 Averaging RESPONSE MENU gt gt COAXIAL DELAY WAVEGUIDE DELAY TABLE DELAY Sa 4 M2 log MAG REF 59 0 da EN 10 0 da 1 V_ 1 9955 da e A s L T A Averaging Off A _ Averaging On CENTER 32 265975000 GHz SPAN 15 202222000 GHz 11 Probably the most frequently used feature to improve the data presentation is averaging Press RESPONSE MENU then AVERAGING ON restart The active function is now the averaging factor applied to the measurement Averaging is used to extend the effective dynamic range of the measurement and thus improve accuracy and resolution Although averaging is performed on the digitized data by the HP 8510 central processing unit it operates like a vari able bandwidth IF filter to reduce the effect of random noise and other time variant errors on the displayed trace In the Ramp sweep mode averaging is accomplished on a sweep by sweep basis by a
11. LOAD then specify the file type and file name Measurement results are stored in the CITIFile format which allows easy transfer to data processing applications These files consist of ASCII characters defining the frequency range and the data at each measurement frequency If 2 Port correction is On data for all four basic parameters are saved This CITIFile format is described in other documents supplied with the HP 8510 The HP 8510 allows you to measure a subset of the current frequency range without recalibration After calibration new Start Stop or Center Span frequencies can be stored in a dif ferent cal set With correction On perform this sequence MORE MODIFY CAL SET FREQUENCY SUBSET Position markers using SUBSET START STOP CENTER SPAN CREATE amp SAVE CAL SET n 1 8 cal set for subset As shown here markers appear on the trace to show you the current center and endpoints of the frequency subset Position these markers by pressing SUBSET START STOP CENTER or SPAN softkeys then using the knob STEP keys or numeric entry When the markers are positioned correctly press CREATE amp SAVE then select a cal set A frequency list is created error coefficients for all frequency points in the selected range are transferred to the new cal set and cor rected data for the subset is displayed To measure the original range recall the original cal set 18 Overview Source Incide
12. discontinuity Smoothing Aperture Linear Block Average Produces Value for Middle Point End Points Duplicated As Necessary After selecting the minimum aperture you may increase the effective aperture of the measurement using the smoothing function Press RESPONSE MENU then SMOOTHING ON Use the knob or numeric entry to set the effective aperture Note that increasing the aperture smooths the group delay trace removing fine grain variations form the response This is why when comparing group delay meas urements the aperture must be specified 26 S21 log MAG REF 50 0 e SRE 1 18 0 dB V 22 565 4B hp TIME 7 Low PASS a MAR ER 1 35 725 MHz Hr TIME BAND PASS L AUX VOLT gt OUTPUT i Pp ah hk ii SPECIFY 1 TIME SPECIFY CENTER 0 134000000 GHz SPAN 230000000 GHz et FREQUENCY TIME LOW PASS TIME BAND PASS AUX VOLT OUTPUT SPECIFY TIME SPECIFY GATE Reflection Measurements 27 Chapter 4 Time Domain Measurements The HP 8510 with optional Time Domain analysis capability can display the time domain response of the DUT Time domain analysis is useful for isolating a problem in the DUT in time or in distance Time and distance are related by the speed of light and the relative velocity of propagation in the me
13. equal to one means that none of the incident signal is reflected The S parameters are measured in exactly the same way as described above An S parameter is always a complex coefficient consisting of a linear magnitude ratio and a phase angle defined with the DUT embedded in a known charac teristic impedance usually 50 ohms These figures show the reflection measurement viewed using the LIN mkr on POLAR format The marker reads out the S parameter directly The center of the circle represents a reflection coefficient magnitude of zero no reflected signal meaning that the device input exhibits a perfect match and all energy is transferred into the device The outermost circle represents unity reflection meaning that all incident energy is reflected The radial lines show phase angle with the 3 o clock position corresponding to 0 degrees that is the reflected signal has the exact same phase angle as the incident signal The amount of power reflected from a device is directly related to the difference in impedance of the device under test and the impedance of the port which delivers the incident energy In fact each value of the reflection coefficient uniquely defines a device impedance I 0 only occurs when the device and the test set impedance are exactly the same The ideal short circuit has a reflection coefficient of 1 180 Every other value for T also corresponds uniquely to a complex device impedance according to the equ
14. i Manj _ do gfx 3697 Sec Frequency Phase Angle Group Delay Y Phase Angle ee 25 This figure shows how introducing linear insertion phase using coaxial electrical delay allows determination of non linear insertion phase You may change the scale division to view the phase response at very high resolution Note that if you are testing waveguide devices select RESPONSE MENU MORE WAVEGUIDE DELAY enter the cutoff frequency of the particular waveguide media under test then press ELECTRICAL DELAY This measurement shows the phase response of a coaxial fil ter between the 3 dB points Even if the network must be specified in terms of group delay the deviation from ideal phase measurement serves as a good check of the actual phase response Using the dual channel capability press DISPLAY DISPLAY MODE DUAL CHAN SPLIT then compare deviation from linear phase with the group delay measurement described next Deviation from Linear Phase Response T T T YIELDS D N Phase 10 Div 1 Frequency Group Delay The phase linearity of many devices is spec ified in terms of group or envelope delay This is especially true of telecommunications components and systems After calibration select to view the group delay of the DUT A coaxial device with no phase distortion present
15. instrument state 8 is recalled when power is turned On or when is pressed allowing you to define the power up state After the test setup is calibrated connect the device under test and make your measurements Chapters 2 and 3 give examples of various reflection and transmission measurements Use the measurement markers to read the trace value at any point on the trace The measurement markers are controlled using the key the Marker menu structure and the knob or numeric entries Pressing turns on one of the markers actually the last selected marker or after Preset Marker 1 and also displays the Marker menu When you press PRIOR_MENU the Marker menu is replaced by the Marker Values List which displays the values of all On markers in the units of the current format Use the knob or entry keys to control the marker position To return to the Marker menu press or the key Note that the Marker menu has softkeys for each of the five measurement markers The current active marker number is underlined When you turn on another marker it becomes the active marker the previous marker inverts but does not disappear from the screen To clear the markers from the trace press ALL OFF lt lt oR gt FOUR PARAMETER The five marker list can be selected for any display mode The four parameter marker list can only be selected with a four param eter display Four Parameter Displays Only 19 Nov 90 11 25 00
16. scores PESEE EI AUXICIARY MEN HE GENINEE MEASUREMENT Contacting Agilent By internet phone or fax get assistance with all your test and measurement needs Table 1 1 Contacting Agilent Online assistance www agilent com find assist United States tel 1 800 452 4844 New Zealand tel 0 800 738 378 fax 64 4 495 8950 Country Singapore Malaysia Philippines Thailand Hong Kong Taiwan People s Republic of China India Latin America tel 305 269 7500 fax 305 269 7599 Japan tel 81 426 56 7832 fax 81 426 56 7840 Asia Call Center Numbers Phone Number 1 800 375 8100 1 800 828 848 632 8426802 1 800 16510170 PLDT Subscriber Only 088 226 008 outside Bangkok 662 661 3999 within Bangkok 800 930 871 0800 047 866 800 810 0189 preferred 10800 650 0021 1 600 11 2929 Canada tel 1 877 894 4414 fax 905 282 6495 Europe tel 31 20 547 2323 fax 31 20 547 2390 Australia tel 1 800 629 485 fax 61 3 9210 5947 Fax Number 65 836 0252 1 800 801664 632 8426809 1 800 16510288 PLDT Subscriber Only 66 1 661 3714 852 2506 9233 886 2 25456723 10800 650 0121 000 800 650 1101
17. that tests inter nal operation as well as operation of the other system instruments If the HP 8510 system configuration has not changed since it was last turned off and if the system does not include multiple test sets the network analyzer will begin making measure ments The actual measurement after power up will vary according to the actual instrument state stored in the HP 8510 Instrument State number 8 This state is very close to the stan dard Preset state unless it has been changed by the user However all properly functioning systems will display the oper ating system firmware issue in the active function area Warm Up Time In a typical environment the system will be ready to make measurements immediately with about 30 to 90 minutes warmup required to meet all system performance specifications When you are finished with the system power can be left applied to the test set and the source source in STANDBY in order to minimize warmup time Multiple Test Sets If multiple test sets are included in the system look at each of the test sets front panel Active indica tors to determine which of the test sets is active ACTIVE indicator lighted If two or more of the test sets show the Active indication it will be necessary to manually initialize the system for the measurement by using the HP IB Addresses menu Press the key to display the HP IB Addresses menu Now press ADDRESS of TEST SET The Active Function area shou
18. to measure reflection error terms a thru to measure transmission tracking and load match and an open trans mission signal path to measure isolation Almost any Cal Kit may be used to accomplish this calibration Select FULL 2 PORT from the Cal Type selection menu then press REFLECT N The correct parameter for the cal ibration step is selected automatically Proceed by connecting the calibration standards at Port 1 S and at Port 2 S in any order Next select TRANSMISSION connect the thru and press each of the softkeys in turn then press TRANS DONE On the Isolation menu choose OMIT ISOLATION except when you are measuring devices with very high insertion loss For high dynamic range measurements connect loads to Port 1 and Port 2 choose an averaging factor of 128 or greater use RESUME CAL on the Cal Menu and select FWD ISOL N then REV ISOL N After pressing SAVE 2 PORT CAL then selecting a cal set the HP 8510 will turn correction on and switch the stim ulus between Port 1 and Port 2 for fully calibrated measurements of all four S Parameters 14 CAL TYPE SET FREQ LOW PASS THRU T CONNECT PORT 1 PORT 2 CALIBRATE RESPONSE raras CONNECT IDENTICAL REFLECTIONS PORT 1 RESPONSE PORT 2 de ISOUN 1 PORT 22 REFLECT SHORT ISOLATION SELECT OMIT ISOLATION OR USE AVERAGING FACTOR LINE 2 128 2 18 UNE CONNECT LINE APPROPRIATE FOR FREQUENCY RANGE LOWBAND REFLECT N CONNE
19. ATE START CENTER SPAN GATE SHAPE START STOP oe 38 tr S21 log MAG REF 80 0 de 10 0 4B gt n Gate Off J Gate On i i Y START 119000000 GHz STOP 0 1439208000 GHz the time domain response to see the effect of potential design changes We do this by mathematically gating out the undesired responses In this example we see the effect of removing the leakage and triple travel responses using the gating feature Press SPECIFY GATE GATE CENTER Use the knob to center the gate on the main path response GATE SPAN Use the knob to adjust the gate span to enclose the main path response GATE ON Only the responses inside the gate are retained You have selected the center time and span time of a signal pro cessing algorithm that works like a temporal time bandpass filter Return to the frequency domain and see that this change yields better out of band rejection for this device Please refer to the Time Domain Measurements section of the HP 8510 Operating and Programming manual for a complete description of all of the time domain operating modes and features 30 Single Channel and Dual Channel Measurements
20. B hp c a MARKER 1 9 55 GHz D H START 6 250000000 GHz START 5 0000000 0 GHz STOP 13 725000008 GHz STOP 15 0000 0000 GHz In the Dual Channel displays as you make changes to the instrument state notice that some settings are Coupled meaning that the setting always applies to both channels and others are Uncoupled meaning that the setting applies only to the current selected channel An example of the a function that is always coupled is Number of Points on the Stimulus menu An example of a function that is always uncoupled is Averaging on the Response menu There is a subset of the Stimulus functions which may be uncoupled by selecting STIMULUS MORE UNCOUPLED CHANNELS Now the stimulus values are listed individually for each channel Select CHANNEL 1 or CHANNEL 2 then select a function and change its value For example change the Start and the Stop frequency on one channel to achieve an alter nate sweep of the two frequency ranges 32 Factory Preset Instrument State Selected Channel 1 no menu displayed SAVE RECALL Instrument States 1 through 8 not changed Correction Off Cal Sets not changed Stimulus Maximum sweep range of source and test set NUMBER OF POINTS 201 Source power depends upon source Test set attenuation 0 dB SWEEP TIME 100 ms RAMP SWEEP CONTINUAL Flatness OffC
21. CT AND MEASURE See IN ANY ORDER TRL 2 PORT What is a Cal Set Cal Set Limited Instrument State Contents Parameter s Frequency Range Number of Points Source Power Sweep Time Power Slope Sweep Mode Ramp Step Single Point Frequency List Trim Sweep CAL SET RULES Will not turn On if current parameter not included Turns Off if new parameter selection not included Frequency Range Turns Off if changed Number of Points In Ramp Step Single Point Number of Points may be reduced Parameters Source Power Message Sweep Time CAUTION CORRECTION MAY BE INVALID Displayed if changed You must determine if the change invalidates the calibration Power Slope Ramp Step Trim Sweep 15 TRL 2 PORT calibration type uses multiple measurements of the thru connection identical reflection standards at each port and a transmission line of appropriate length and impedance to measure the error terms If proper standards are available this is the preferred technique due to fewer connections required and the potential for more accurate characterization of the error terms More details of this calibration procedure are contained in other documentation supplied with the HP 8510 system A cal set contains the error coefficients for each frequency measured during the calibration sequence After correction is turned on the measurement at each frequency is used with the error coefficient s for that
22. ET 1 or any other C appears when correction is applied to current parameter symbol disappears when data acquisition is complete CAL TYPE MENU CORRECTION SET FREQ LOW PASS CAL CALIBRATE RESPONSE RESPONSE amp ISOL N S11 1 PORT RESUME CAL SEQUENCE MORE How Often do I need to Calibrate This can be a complicated question but the actual answer is The calibration remains valid as long as nothing changes This means no changes to the uncorrected leakages directivity and isolation mismatches source match and load match and frequency response of the system The network analyzer is designed with stability as a prime consideration so given ade quate warm up time and a constant temperature drift of the system instruments is typically not a problem over the term of 6 8 hours In practice changes in the environment especially temperature between calibration and measurement is the major cause in drift The major effect is a change in the physical length of external and internal cables Another important factor is dirt or damage of the test port connectors If the connectors become dirty or damaged repeatability is affected ERROR COEFFICIENTS Frequency Response Reflection or Transmission Calibration e Simple Procedure e Requires only a thru for transmission measurements or e Requires a short circuit or open circuit for reflection measurements Applies only to current parameter
23. LY DISCLAIMS THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE EXCLUSIVE REMEDIES THE REMEDIES PROVIDED HEREIN ARE BUYER S SOLE AND EXCLUSIVE REMEDIES AGILENT TECHNOLOGIES SHALL NOT BE LIABLE FOR ANY DIRECT INDIRECT SPECIAL INCIDENTAL OR CONSEQUENTIAL DAMAGES WHETHER BASED ON CONTRACT TORT OR ANY OTHER LEGAL THEORY Notice Hewlett Packard to Agilent Technologies Transition This documentation supports a product that previously shipped under the H ewlett Packard company brand name The brand name has now been changed to Agilent Technologies The two products are functionally identical only our name has changed The document still includes references to Hewlett Packard products some of which have been transitioned to Agilent Technologies cd Bee Agilent Technologies Printed in USA March 2000 Chapter 1 Chapter 2 Chapter 3 Chapter 4 Chapter 5 Contents Operating the HP 8510 Getting Acquainted The Network Analyzer System Turn On System Power General Measurement Sequence Step 1 PRESET or RECALL Instrument State Step 2 Test Setup Connections Step 3 System Control Settings Step 4 Perform Measurement Calibration Step 5 Save Instrument State Step 6 Measure Device Under Test Step 7 Read Measured Value Step 8 Output Measurement Results Reflection Measurements Overview General Setup Multi Port Devices Measuring Return Loss Measuring Reflection Coeff
24. User s Guide Agilent Technologies 8510C Network Analyzer Introductory This manual provides documentation for the 8510C Network Analyzers v t Agilent Technologies Manufacturing Part Number 08510 90290 Printed in USA February 1994 Copyright 1991 1994 2001 Agilent Technologies WARNING CAUTION NOTE Notice The information contained in this document is subject to change without notice Agilent Technologies makes no warranty of any kind with regard to this material including but not limited to the implied warranties of merchantability and fitness for a particular purpose Agilent Technologies shall not be liable for errors contained herein or for incidental or consequential damages in connection with the furnishing performance or use of this material Safety Information The following safety symbols are used throughout this manual Familiarize yourself with the symbols and their meaning before operating this instrument Warning denotes a hazard It calls attention to a procedure which if not correctly performed or adhered to could result in injury or loss of life Do not proceed beyond a warning note until the indicated conditions are fully understood and met Caution denotes a hazard It calls attention to a procedure that if not correctly performed or adhered to could result in damage to or destruction of the instrument Do not proceed beyond a caution sign until the indicated co
25. a broadband impulse of microwave energy The trace goes negative because the short circuit inverts the phase of the pulse As you remove the short circuit notice that the impulse becomes positive because the open circuit does not invert the phase of the impulse With the short removed select TIME BAND PASS and notice that the impulse is approximately the same whether a short or an open is connected Marker 28 y t START STOP 0 045020008 GHz 20 09900000000 GHz S11 LINEAR REF 0 0 Units 4 20 98 mUnits V 128 11 mu mo T c MAR rn START 1 0 ns STOP 17 0 ns Transmission Measurements RF Input Absorber o RF Output Setup Surface Acoustic Wave Calibrate RF Input RF Output Leakage Main Wave Triple Travel Measure 29 Now connect the cables These figures show the frequency domain response and the time domain response of the cables under test The complex ripple pattern in the fre quency domain is caused by reflections from the adapters interacting with each other By transforming this data to the time domain you can determine the magnitude of each reflection versus distance along the cable As an experiment loosen the adapters connecting the two cables and observe the responses You can change the start and stop time using the STIMULUS and controls t
26. and Port 2 together THRU DONE RESPONSE CAL SET 1 TIME BAND PASS Measurement calibration with a thru sets the reference plane the point connecting Port 1 and Port 2 to a transmis sion coefficient of 1 and 0 degrees at zero seconds The time domain response should show a response magnitude of 1 00 at zero seconds 521 log MAG REF 50 0 4B a 18 2 dB V 22 565 4B hp a MARKER 1 35 725 MHz i TIME ES IN BAND PASS AUX VOLT OUTPUT SPECIFY TIME SPECIFY GATE CENTER 13498 0 GHz SPAN 0 0308222000 GHz FREQUENCY ip T TIME Low PASS TIME 376 w BAND_PASS 2 c a MARKER 2 H i 59 ps AUX VOLT OUTPUT SPECIFY TIME SPECIFY GATE Now connect the SAW filter These figures show the fre quency domain response and the time domain response of this device Note the three components of the transmission time domain response RF leakage at near zero time the main travel path through the device about 1 6 microse conds and the triple travel path about 4 5 microseconds travel time Each of these signal paths is shown in the measurement Time Domain Gating Time domain analysis also lets you remove individual parts of S21 fog MAG REF 65 0 dB 10 0 dB GATE ON a a GATE S AN 01 ps 604 G
27. at when a parameter is selected the measurement is displayed in the format last selected for that parameter For example press then SMITH CHART This meas urement can show the actual complex impedance of the device under test Now select S and DELAY a measure ment of the transit time for the transmitted signal Switching between the parameters with each parameter keeping its preferred format is accomplished without addi tional keystrokes This may seem like a minor feature but it is an example of how the HP 8510 is designed to pro vide maximum convenience to the user Press to automatically scale the selected format for display of the complete measurement trace The SCALE S log MAG Puno REF VALUE and keys along with the ENTRY eo block control the display presentation The trace is always ER positioned on the graticule according to its value with point 101 CENTER 35 213500000 GHz AN 4 592020000 Sit REF 90 48 mumits 4 16 1 mUnits V 26 036 de 4p 67 5 3 GHz CENTER 35 109401605 GHz SP 174339222 GHz respect to the value of the graticule reference position line For Cartesian displays such as and the reference position can be any horizontal line For Polar formats such as LOG mkr on POLAR and LIN mkr on POLAR the reference position is the outer circle for magnitude and zero degrees for phase For con
28. ation Z 1 T T where Z is the device impedance normalized to i e divided by the measuring system characteristic impedance After Preset the system characteristic impedance Z is set to 50 ohms Thus the center of the Smith chart is 50 ohms When you select SMITH CHART the current system Zp the SET Z function in the Cal menu is the center of the chart and the marker reads the impedance data in R jX format where R is the resistive component of the imped ance and jX is the reactive component of the impedance This display shows the complex impedance of the DUT Select MARKER then use the knob to read the complex impedance at any point on the trace Note that the marker annotation tells that the complex impedance is capacitive in the bottom half of the chart and inductive in the top half of the chart Overview Source Incident Transmitted Q gt g er p SEPT General Setup Setup Source Ref Test Power Splitter Calibrate Incident Transmitted Power Power Me asure Measuring Insertion Loss and Gain S21 log MAG REF 0 0 dB A 10 0 dey V 0 6340 48 ip i ps T ct A i MARKER 1 8875 GHz i fie E ES be e e o aoe z he E p N a i i Saal as eater aS wl fem be eee A le tl A A CENTER 7 000000000 GHz SPAN 2 500000000 GHz Chapter 3 Transmission Measurements The reflection measurements discussed in Chapter 2 are only pa
29. bing the current measurement configuration Define the Output restores the standard plot and list definitions In general this means that a full size plot or complete list of data will be output The Define Plot menu allows selection of the parts of the CRT display that will be plotted Use the Define Print menu to specify details about how the plot should appear on a graphics plotter For lists the skip factor is used to specify the actual number of data points to be listed and other keys are used to specify other details of the frequency and data presenta tion The results are listed in units of the current format the same as the marker DISC SETUP DISC MENU DISC UNIT NUMBER DISC VOLUME INITIAUIZE DOS DISC INITIAUZE UF DISC DISC MENU DIRECTORY STORE LOAD DELETE UN DELETE STORAGE IS log INTERNAL EXTERNAL SET UP DISC INITIALIZE DOS DISC MENU INIT DOS YES NO INITIALIZE UF DISC MENU INIT UF YES NO DATA TYPE SELECT MENU INST STATE 1 8 ALL MEMORY 1 8 ALL DATA TYPE SELECT MORE MENU FORMATTED DELAY TABLE USER DISPLAY HARDWARE STATE MACHINE DUMP Create a Frequency Subset MAG SUBSET START STOP CENTER SPAN 10 0 dB V 0 2832 4B START STOP log 500000000 GHz 18 000000000 GHz MAG CREATE amp SAVE
30. cident Power 9 Multi Port Devices 19 Reflection measurements determine how much energy is reflected from the device input port When the device has more than one port care must be taken to terminate the unused port s in the system characteristic impedance If this is not done reflections from the unused ports may appear at the test port causing measurement errors With the S parameter test set measurement port 2 provides this termination In any case the signal reflected from the device is most often measured as a ratio with the incident signal and can be expressed as return loss or reflection coefficient These measurements are mathematically expressed as reflection coefficient reflected incident p29 linear magnitude ratio and angle Return Loss 20logp SWR 1 p 1 p Thus the reflection coefficient consists of a linear magni tude ratio and the angle of the reflected signal Return Loss is the difference in dB between the reflected and the incident signal and SWR is a computed value Setup Calibrate Measure Measuring Return Loss S11 log MAG REF 0 0 de i 5 0 ca V_ 13 87 08 Po CENTER 32 265975000 GHz SPAN 4 500220000 GHz Measuring Reflection Coefficient Magnitude CENTER 7 D00000008 GHz SPAN 2 500000000 GHz Stimulus and NUMBER of POINTS as required as required CAL 1 CALIBRATE RESPONSE Connect Shor
31. ctory Preset always selects the fastest sweep time appropriate for the HP 8510 data acquisition process The optimum sweep time for a particular measurement is as fast as possible while allowing time for the device under test to respond A practical method for determining this optimum sweep time is to connect the device under test then slow the sweep as necessary until the device response does not change Too fast a sweep time will be indicated by smooth ing of narrow responses Press STIMULUS then the SWEEP TIME softkey and use the knob or STEP keys to adjust the sweep time In the Step and Frequency List sweep modes the sweep time function label changes to DWELL TIME allowing you to set the dwell time between when the source is locked to the measurement frequency and the measurement is actually made This feature allows you to control the measurement process so that the device can respond to the new frequency before the measurement is made Dwell time is set in the same way as sweep time In general the time to accomplish a single 201 point Step sweep is about 100 times greater than the time required for a single Ramp sweep Averaging does not slow the Step sweep appreciably with fewer than about 32 averages Thus a Ramp sweep measurement using 32 averages takes about the same time as a Step sweep with 32 averages If a greater number of averages is used the time for Ramp sweep increases faster than for a Step sweep For an HP 8510 u
32. d for the various annotations which communicate to the operator Measurement Display rea Stimulus Values R Channel Selection The HP 8510 has two separate identical measurement channels To select the channel for display press CHANNEL 1 or CHANNEL 2 An indicator above the keys lights to show the current selected channel Basic Measurement Functions S P F R Next there are groups of keys for the measurement setup measurement calibration data presentation and data output functions The basic measurement and display functions are specified using keys in the STIMULUS PARAMETER FORMAT and RESPONSE blocks Knob and Numeric Entry The value of the active function is changed using the ENTRY controls The knob changes the function value in steps related to the current function value En and the speed of the knob The STEP keys change the active function value by a proportional increment each time the key is pressed Enter a numeric value using the numeric the decimal and the toggle then pressing the appropriate units key The G n My and keys are general purpose terminators having values of 102 10 10 10 and 103 1073 respectively and the x1 key is used to specify the basic units for the quantity for example Hz To specify the Start frequency of 3 GHz press START 3 then G n Press to clear the active function area GS Ge UNO 00089 ge
33. dium of the DUT By setting the actual velocity of propagation using the VELOCITY FACTOR function on the menu the converion to distance is displayed The HP 8510 measures the transmission or reflection frequency domain response of the DUT and uses an inverse Fourier transform to convert the data to the time domain To begin familiarizing yourself with the time domain controls press and look at the Domain menu Notice that FREQUENCY is underlined All previous measurements have used the Frequency domain The two keys of interest here are TIME LOW PASS TIME BAND PASS that select two different time domain modes There are several considerations for use of each mode but the simple guideline is to use TIME LOW PASS for devices which have adequate low fequency responses or at least down to about 100 MHz or use TIME BAND PASS for devices which are band limited For example when measuring a coaxial cable the Low Pass mode is probably the best choice When measuring a filter the Band Pass mode is probably better If you use Time Low Pass for a device which does not have sufficient low end frequency response the time domain measurement will be very noisy and it will be necessary to use averaging Since the frequency domain data is used to develop the time domain response the first step is to perform an appropriate measurement calibration As examples we first use time domain analysis to locate and analyze points of reflection a
34. e deviation from ideal phase shift over a frequency range of special interest such as the pass band of a filter The HP 8510 measures the phase response and can express it in two different ways directly as deviation from ideal phase or as group delay a derived value Deviation from Ideal Phase For coaxial devices insertion phase consists of two components linear phase which is characteristic of coaxial media and non linear phase shift which can cause unwanted distortion For waveguide compo nents insertion phase consists of the characteristic dispersion of the waveguide media and the non ideal phase shift which can cause unwanted distortion Deviation from ideal phase is a measure of the non characteristic phase shift included in the insertion phase By compensating for the ideal insertion phase the deviation from ideal phase over the frequency sweep can be measured directly Compared to group delay deviation from ideal phase is a fun damental measurement because group delay is the derivative of phase change with frequency Also greater phase sen sitivity allows a greater dynamic range than group delay measurements and deviation from ideal phase will produce greater detail in areas where the phase response changes rapidly over a small frequency range 24 RF Filter Response Phase 45 Div Y t Frequency Electrical Length Added
35. en the markers To measure passband flatness at high resolution select MORE MARKER to MAXIMUM The trace is moved to the center graticule then the scale division is set to view the passband flatness at high resolution The measurement can also provide information about the phase shift or insertion phase of a network Since measurement calibration for any parameter applies to all format selections for that parameter unless the frequency range is changed this measurement can be made using the previous calibration Calibration for insertion phase sets the phase to zero degrees at all frequency points with the thru connection After con necting the test device select to display the relative phase shift between the output signal and the input signal This figure shows the insertion phase of a bandpass filter The HP 8510 phase measurement range is 180 degrees to 180 degrees and the vertical trace represents the tran sition between these values Thus the trace between any two of these transition lines represents 360 degrees of phase shift Measuring Electrical Length S21 Z REF 0 0 188 0 7 V 61 443 gt ap c Pp 2 S A ELE TRACAL DELAY 3 Poot az 5 EE I E START 5 950569850 GHz STOP 8 053930000 GHz E a a ELECTRICAL DELIAY 16 981 ns ds a
36. end of this document shows a partial list of important Factory Preset conditions Because an instrument preset is sent to all instruments connected to the HP 8510 system bus the time required for this operation to complete depends upon the equip ment connected to the system bus Set up the test port cables and connectors for your particular device under test requirements Set up the network analyzer instrument state in these steps e Use the STIMULUS keys to set the desired start and stop frequencies number of measured points and other characteristics of the frequency sweep Use the PARAMETER keys to select the parameter to be measured and displayed e Use the FORMAT keys to select the type of graticule for display of the measured data Use the RESPONSE keys to position the trace for viewing Use the keys under and connect appropriate calibra tion standards where the device under test will be connected in order to improve the accuracy of the meas urement Use the keys to store the current control settings in internal non volatile memory and the keys to recall previously saved instrument states With error correction on when the device under test is con nected its response will be displayed on the CRT Use the keys and the knob to position the meas urement marker s to points of interest on the trace Use the keys to select data output to printer and or plotter Use the key to direct measurement result and inst
37. er is set too high or too low Select Parameter Keys in the PARAMETER block allow you to select the S parameter to be measured and displayed Recall that S parameters are always defined as a ratio and they are repre sented by the notation Soun Where u represents the emerging signal and represents the incident signal There fore S is the ratio of the signal emerging from port 1 to the signal incident at port 1 or as shown in the signal flow diagram the ratio b a After Preset Channel 1 displays S and Channel 2 displays S if selected ar Sa b by Siz a a Forward Reference b Forward Transmitted b Reflected at Port 1 a Reverse Reference Select Format for Display LOG MAG PHASE DELAY SMITH CHART SWR LINEAR MAGNITUDE LIN mkr on POLAR LOG mkr on POLAR Re Im mkr on POLAR INVERTED SMITH REAL IMAGINARY dB degrees seconds R jx p reflection qt transmission Position Response for Viewing Twelve different display formats provide a comprehensive selection of useful presentations The keys in the FORMAT block and displayed by FORMAT also select the marker units shown by the active marker This list shows the trace value and marker units for each of the standard format selections Examples of how these formats are used for various reflection and transmission measurements are discussed in later chapters Notice that the Parameter and Format keys are associated such th
38. fects are negligible if either the reflected signal from Port 1 is large or if the DUT greatly attenuates the mismatch signals seen from the output port For best accuracy the Lowband load is used below 2 GHz and the Sliding or the Offset load is used above 2 GHz 2 Port Calibration Most accurate for measurement of 2 Port DUT e Measures 12 error terms e Best applied using S Parameter Test Set The HP 8510 offers two calibration choices to achieve 2 Port error correction FULL 2 PORT and TRL 2 PORT Both of these calibration types use all 12 error terms and use the same accuracy enhancement mathematics to cor rect the measured data The difference between them is the calibration standards used and the technique used to quantify the error terms This is the most complete calibration procedure for meas urement of transmission and reflection characteristics of 2 port devices Twelve systematic errors are quantified six for the forward S parameters and six for the reverse S parameters These are Directivity Source Match and Fre quency Response for both Port 1 and Port 2 reflection signal paths and Isolation crosstalk Load Match and Frequency Response for the forward and reverse transmis sion signal paths In order to accomplish error correction for a two port DUT all four DUT S parameters must be measured FULL 2 PORT calibration uses Opens Shorts and Loads at each port in exactly the same way as the 1 Port calibra tion
39. frequency in the error model equation to obtain and plot the corrected value Along with the error coefficients a cal set also contains a subset of the complete instrument state that includes important instrument settings used for the calibration The contents of this Cal Set Limited Instrument State are listed here If one of the instrument settings in the cal set limited instrument state is changed the HP 8510 either displays a caution message and turns correction off or simply displays a caution message Note that some instrument changes to the instrument state make the cal set invalid Other changes do not cause correction to be turned off but leave it to the user to decide whether or not the corrected data remains valid Also note that turning on correction automatically recalls the cal set limited instrument state placing the HP 8510 stimulus functions to the same values as during the measurement calibration To see this feature operate change the Start and Stop frequencies for the current cal set The message is displayed and correction is turned off Now press CAL CORRECTION ON then specify the previous cal set Note that the sweep frequencies are changed back to those which apply to the specific cal set This feature makes it convenient to calibrate several different frequency ranges then when measuring the device change frequency ranges by simply selecting a different cal set After calibration in the Ramp Step o
40. ices in each of the function groups are extended using CRT displayed menus Pressing a key presents a selection of additional function key labels on the CRT This is called a softkey menu Each menu lists the possible choices for a particular function with each choice corresponding to one of the eight softkeys located to the right of the CRT Press the softkey to the right of the function label to activate the function Every key when pressed either activates the function possibly changing the state of the system or presents the next level softkey menu For example pressing the key makes a trace marker the active function and also presents the first level marker menu to allow selection of other marker functions You may press any key at any time in any sequence without fear of damaging the sys tem although the measurement result may not always be meaningful First turn on power to the source test set and other peripherals connected to the HP 8510 Now turn on power to the HP 8510 by setting the LINE rocker switch on the IF Detector to ON then depressing the LINE pushbutton switch on the Display Processor It is recommended that the net work analyzer Display Processor be turned on last to allow all other instruments on the 8510 system bus to go through their start up cycle then the HP 8510 can gain control Power On Sequence As soon as power is applied the network analyzer performs a self test sequence
41. icient Magnitude Measuring Standing Wave Ratio Measuring S Parameters Measuring Impedance Transmission Measurements Overview General Setup Measuring Insertion Loss and Gain 3 dB Bandwidth Out of Band Rejection Passband Flatness Measuring Insertion Phase Measuring Electrical Length Measuring Phase Distortion Time Domain Measurements Reflection Measurements Transmission Measurements Time Domain Gating Measurement Enhancements Single Channel and Dual Channel Measurements Single Channel Single Parameter Single Channel Four Parameter Dual Channel Coupled and Uncoupled Channels Preset Instrument State Pulse and Waveguide Systems 19 22 27 31 Chapter 1 Chapters 2 and 3 Chapter 4 Chapter 5 Operating and Programming Manual Installation and Service Keyword Dictionary Pocket Guide What s in this Guide This User s Guide provides an introduction to the HP 8510 Network Analyzer showing how the instrument is used to characterize the frequency and time domain performance of network components Rather than being a formal text on measurement theory and techniques this guide is intended to help you get hands on experience with the network analyzer using example procedures to illustrate network analyzer operating sequences in actual measurement situations This helps you to get started making network measurements using the HP 8510 and demonstrates the ease with which accurate results can be obtained
42. ignal separation components and the internal Local Oscillator LO Above 50 GHz the system uses the waveguide millimeter wave mm wave test set This consists of the band indepen dent test set controller and two test set modules for the specific frequency band The test set modules contain the signal separation and first frequency conversion stages This configu ration requires two sources one for the stimulus RF and one for the LO System setups and measurement related data may be stored and loaded using the HP 8510 front panel disk mass storage unit or any external HP IB compatible mass storage unit The HP 8510C can control hardcopy output devices such as a line printer graphics printer and graphics plotter using HP IB or RS 232 protocol These devices may be connected to the HP 8510 system interface bus or to either of the two RS 232 ports on the rear panel of the display processor Parameter Format Reference Line Value L Scale Division Marker Parameter Value Channel 1 Identification Channel 2 Identification Title System CRT Display The front panel of the network analyzer is Messages relatively simple It is shown in full by the foldout at the end Active of this document First there is the CRT which presents the Function Area Enhancement Labels measurement results This illustration shows the general areas for the measurement trace an
43. ld display an address between 20 and 23 Initialize by selecting each test set in turn Depending upon how many test sets are in the system first enter then press x1 then 21 1 22 GO 23 to select each test set in turn With each address entry the selected test set Active indicator will light then extinguish when the next test set is selected Finally enter the address of the test set to be used mm Wave Test Set If the mm wave test set modules have been changed to a different frequency band the HP 8510 will display an error message and a beeper may sound Do not be alarmed You may disable the beeper by pressing then BEEPER OFF If line power is applied to all instru ments and all cables are connected properly this error means that it is necessary to configure the HP 8510 Hard ware State memory for the new frequency band This memory is loaded from a System Disk supplied with the HP 8510 System Disk Multiple source systems are supplied with a system disk which contains several files for the different coax ial and mm wave hardware configurations To load HP 8510 memory with the correct harware configuration proceed as follows Insert the System Disk in the HP 8510 front panel disk drive e Press DIRECTORY Read the displayed directory to find the correct file for your current hardware configuration The file names will be MD_COAX for a coaxial test set or MD_WR 155YN for a mm wave test set covering 50
44. m With experience you will be able to see changes in the reference responses that indicate a need to perform the measurement calibration again 13 CAL TYPE 1 PORT CAL SET FREQ Low PASS BROADBAND CALIBRATE RESPONSE SLIDING RESPONSE de ISOL N LOWBAND S11 1 PORT Offset Load 22 1 PORT ONE PATH 2 PORT FULL 2 PORT TRL 2 PORT STANDARD SELECTION SAME STANDARDS AS 1 PORT S11 PORT 1 S22 PORT 2 CONNECT PORT 1 PORT 2 FOR TRANS AND MATCH MEASUREMENTS REFLECTN DONE FWD TRANS THRU CAL TYPE FWD MATCH THRU SET FREQ LOW PASS REV TRANS THRU CALIBRATE RESPONSE REV MATCH THRU RESPONSE amp ISON S11 1 PORT FWD ISOL N ISOL N STD REV ISOL N SELECT OMIT ISOLATION OR USE ISOUN STD AVERAGING FACTOR gt 128 CONNECT AND MEASURE IN ANY ORDER 1 Port Reflection Calibration Most accurate for 1 Port devices Good choice for measurements of small or large reflections e Requires three terminations open short load Applies only to or S This calibration routine removes all three of the systematic error terms for a reflection measurement of a one port DUT These are Directivity Source Match and Reflection Signal Path Frequency Response It is best applied to measurement of a one port device because it does not remove the mis match effects seen from the output port of a 2 port DUT These output mismatch ef
45. main Stimulus FREQUENCY START and NUMBER of POINTS as required as required Parameter Format Response CAL 1 SET FREQ LOW PASS CALIBRATE RESPONSE Connect Short at Port 1 SHORT DONE RESPONSE CAL SET 1 Notice that when you pressed SET FREQ LOW PASS the frequency range may have changed This is done because we will show both the Low Pass and the Band Pass responses although it is not required when viewing only the Band Pass response The frequency range is automati cally set to meet the harmonic frequency step requirements of the Low Pass mode Domain TIME BAND PASS MORE MARKER to MAXIMUM After calibration with the short circuit still connected view the Time Band Pass response Measurement calibra tion with a short circuit sets the reference plane to a reflection coefficient of 1 and 180 degrees at zero sec onds If the short circuit is not offset like the 7 mm short the time domain response should show a response of 1 00 at zero seconds The Band Pass trace shows the response of the device as if it had been stimulated by an impulse of RF energy with bandwidth of the frequency span Since the short circuit reflects totally the response shows the shape of the stimulus impulse TIME LOW PASS SET FREQ LOW PASS SPECIFY TIME IMPULSE This is the Time Low Pass Impulse response of the short circuit Here the trace also shows the effect of stimulating the device with
46. nditions are fully understood and met Note calls out special information for the user s attention It provides operational information or additional instructions of which the user should be aware The instruction documentation symbol The product is A marked with this symbol when it is necessary for the user to refer to the instructions in the documentation This symbol is used to mark the on position of the power line switch i This symbol is used to mark the standby position of the power line switch This symbol indicates that the input power required is AC WARNING WARNING WARNING CAUTION This is a Safety Class 1 Product provided with a protective earth ground incorporated in the power cord The mains plug shall be inserted only in a socket outlet provided with a protected earth contact Any interruption of the protective conductor inside or outside of the product is likely to make the product dangerous Intentional interruption is prohibited No operator serviceable parts inside Refer servicing to qualified personnel To prevent electrical shock do not remove covers If this product is not used as specified the protection provided by the equipment could be impaired This product must be used in a normal condition in which all means for protection are intact only Always use the three prong AC power cord supplied with this product Failure to ensure adequate grounding may cause p
47. nel are displayed Averaging Factor and Electrical Delay type Coaxial Waveguide or Table will be the same for all parameters always coupled to channel all other Response functions Electrical Delay and trace slope and offsets are part of the P F R memory and apply only to the current selected parameter on the current channel The data acquisition process continues and the traces are updated as the data becomes available Notice that the DOMAIN is tne same for all displayed parameters also always coupled to channel Press DOMAIN TIME BAND PASS then switch between Channel 1 and Channel 2 Press MARKER then select a marker Using the Four Parameter display the value of the current selected marker for each of the S parameters appears in the marker value display area Dual Channel The HP 8510 Dual Channel mode allows display of one parameter from each measurement channel Press DISPLAY MODE DUAL CHAN OVERLAY or DUAL CHAN SPLIT Notice that the Channel Identification annotations for both Channel 1 and Channel 2 are displayed To make changes in the control settings for a channel first select the channel by pressing either or CHANNEL 2 then make the change For example select the same parameter on both channels then select the Frequency Domain for Channel 1 and the Time Domain for Channel 2 Coupled and Uncoupled Channels S21 S21 REF 40 0 dB REF 40 0 dB 10 0 dB Z 18 0 dB 1 0 4800 dB V 0 4839 d
48. nt pur Reflected General Setup Source Power Splitter Reflected Power DUT Chapter 2 Reflection Measurements The next three chapters of this User s Guide demonstrate the many kinds of network measurements that can be made with the HP 8510 For each example a complete measurement setup is given following the same general measurement sequence described in Chapter 1 The examples used represent typical network measurements using an S parameter test set The DUT used in most of these examples is a bandpass filter but you can use any device For simplicity while learning the instrument connect 7 mm adapters to your device and consider the adapters as part of the device The following paragraphs describe reflection measurements of Return Loss SWR Reflection Coefficient and Impedance Reflection measurements require a directional device such as a directional coupler or directional bridge in the measurement setup This signal separator provides a sample of the power traveling in one direction only For reflection measurements it is connected as shown here allowing the power reflected from the device to be separated and measured independently of the incident power The ratio of these two signals the incident and the reflected is the reflection coefficient of the DUT or when expressed in decibels the Return Loss Terminate multi port device with return Signal cable to port or Separation E z Zo termination In
49. o configure the network analyzer for the measurement Set Stimulus Controls in the STIMULUS block and the menus allow you to set the frequency sweep source power level sweep time number of frequency points to be meas ured and other related characteristics of the incident signal The START and STOP keys and the CENTER and SPAN keys are used to set the limits of the frequency sweep Notice that the stimulus annotation at the bottom of the CRT shows the current frequency sweep in terms of Start Stop or Center Span depeneine upon which of the keys has been pressed last Press the STIMULUS MENU key to present the first level Stimulus menu Now press the NUMBER of POINTS softkey The Number of Points menu provides selection of the number of points to be measured over the frequency sweep Press POINTS 51 101 201 401 or 801 depending on the number of points you wish to measure Because you can reduce the number of points after calibra tion you may wish to calibrate using more points than actually required for the measurement then reduce the number of points later Sweep Modes The RAMP STEP and FREQUENCY LIST softkeys select the sweep mode RAMP and FREQUENCY LIST can be used with any source and STEP may be used when the source is a synthesized sweeper such as the HP 834x or 836x series sources Factory Preset always selects Ramp sweep in which the source is swept from the lowest frequency to
50. o zoom in on the response of interest and you can select any FORMAT although the LINEAR MAGNI TUDE Jand the LOG MAG formats are most useful A good rule of thumb is that the energy travels about 1 foot per nanosecond or about 0 3 meter per nanosecond in free space Most coaxial cables have a relative velocity of about 2 3 the propagation velocity in free space about 10 nanose conds per meter Since you are measuring the round trip distance from the test port to the reflection and back to the test port you will see the response at double the actual dis tance from the port to the reflection Thus to view an entire cable of about 1 meter in length enter a stop time of about 40 nanoseconds To adjust the distance readout of the marker press MORE PORT EXTENSIONS VELOCITY FACTOR With the velocity factor equal to 1 the distance display shows the equivalent electrical length of the signal path rela tive to the speed of light in free space Changing the function to 0 666 sets the time to distance conversion to 2 3 of the speed of light in free space thereby adjusting the marker distance readout In this example we will measure the transmission response of a SAW filter We will use the Time Band Pass mode not because it is simpler but because the DUT is band limited Stimulus START STOP and NUMBER of POINTS as required Parameter Format Response CAL 1 CALIBRATE RESPONSE Connect Thru connect Port 1
51. of these responses Accuracy enhance ment techniques permit measurement calibration at the interface to the device under test minimizing the effect of systematic measurement errors The Network Analyzer System A representative HP 8510 network analyzer system is shown here It consists of the sweeper or synthesizer to provide the RF stimulus the test set which provides signal separation and the first frequency conversion stage and the HP 8510 which consists of two instruments the IF Detector and the Display Processor The HP 8510 controls the system instruments via a dedicated HP IB called the 8510 system bus This direct control allows the HP 8510 to take full advantage of the capabilities of the various system instruments A test set provides the points at which the device under test is connected signal separation devices to measure the four S parameters and the first frequency conversion stage of the receiver The device to be tested is connected between the test set Port 1 and Port 2 Several different test sets are used with the HP 8510 and the system may include up to four test sets From the operator s point of view except for the frequency range and different connection techniques for coaxial and waveguide operation of the HP 8510 is the same regardless of the test set used From 45 MHz to 50 GHz the system uses coaxial test sets there are versions covering different frequency ranges These coaxial test sets contain all s
52. other perti nent maintenance information The HP 8510 Keyword Dictionary provides a very detailed description for each of the manual and remote functions of the system Use the Keyword Dictionary when the tutorial presentations here and in the Operating and Programming manual do not provide sufficient information for your applica tion The HP 8510 pocket size Operating and Programming Quick Reference provides memory aids for the user who is familiar with the HP 8510 Getting Acquainted COAXIAL TEST SETUP HARDCOPY SOURCE oo 00 oo oo or o0 909 00 00 0000 O a D o m o000 200 5 COAXIAL TEST SET IF DETECTOR WAVEGUIDE mm WAVE TEST SETUP HARDCOPY LO SOURCE RF SOURCE SYSTEM BUS oo 00 oo oo ai oo onp nono ao TEST SET CONTROLLER ano0 O o o coco gt a TEST SET MODULE TEST SET MODULE Chapter 1 Operating the HP 8510 The minimum network analyzer measurement system consists of the source the test set the vector signal processor and the display Together these comprise a complete stimulus response test system which provides stimulus to the device under test and measures the signal transmitted through the device or reflected from its input The system then detects and processes the data to provide various displays showing the magnitude and phase
53. oupled Channels Parameter Channel 1 S Channel 2 S Format Channel 1 LOG MAG Channel 2 LOG MAG Response SCALE 10 dB division REF VALUE 0 dB REF POSN 5 COAXIAL DELAY ELECTRICAL DELAY 0 seconds AVERAGING OFF SMOOTHING OFF PHASE OFFSET 0 degrees MAGNITUDE OFFSET 0 dB MAGNITUDE SLOPE 0 dB GHz Cal CORRECTION OFF Zo 50 ohms PORT EXTENSIONS 1 and 2 0s TRIM SWEEP 0 CAL SETS 1 through 8 not changed VELOCITY FACTOR 1 Domain FREQUENCY DOMAIN GATE OFF Display SINGLE CHANNEL SINGLE PARAMETER DATA Trace Memories 1 through 8 not changed MKR List On LIMITS OFF Marker all OFF A OFF System HP IB addresses not changed CRT ON IF GAIN AUTO Copy PLOT ALL FULL PAGE LIST ALL POINTS Disc STORAGE is INTERNAL SAVE USING BINARY FORMAT is LIF Pulse and Waveguide Systems After Factory Preset you should Recall a correct instrument state or manually set these functions Sweep Mode STEP SET Z 1 WAVEGUIDE DELAY WAVEGUIDE CUTOFF Depends upon band SOURCE 1 POWER Depends upon band SOURCE 2 POWER Depends upon band MULTIPLE SOURCE ON Su tog mac REF 10 67 d 4 63 ae HVARF BE 7E7SRSORS GH BSE NET RELEY omenan CHANNEL CHANNEL 2 MARKER 1 31 8235 Ghz dy a ma A ae UA ie CU De E PA AS CCC DO DA Sar wee Ty NN AMAIA FEMME IAN LU UN METIN AH TTE e MJ stor 24 264078008 OUz 20 B27 98 2 IMSS
54. r Single Point sweep modes the number of points can be reduced but not increased Thus after calibration using 401 points either 401 201 101 or 51 points can be selected If a number of points greater than the original calibration is selected a caution message is displayed and correction is turned off When fewer points are selected the instrument skips alternate frequency points For example when the number of points is reduced from 201 to 101 every other point is measured Step 6 Measure Device Under Test Step 5 Save Instrument State Press SAVE then select one of the eight instrument state Step 7 Read Measured Value ANY TOP LEVEL MENU INST STAT E 1 FIVE MARKER MARKER 1 10 31 GHz 0 0711 dB MARKER 2 15 7 GHz 2 7585 dB D gt MARKER 3 47 06 GHz 14 977 dB MARKER Y 25 99 GHz 6 7451 dB MARKER 5 31 38 GHz 9 1055 d8 19 Nov 90 11 22 14 registers to save the current instrument state All control settings including the P F R limited instrument state for each channel are saved Please note that the contents of the cal set are not saved only the reference to any cal sets that are turned on Press RECALL then select one of the eight instrument state registers to recall a previously saved instrument state If the recalled instrument state was saved with cal sets turned on then the HP 8510 will turn on the cal sets so that corrected measurements are displayed Remember that
55. r calibration This is one of the HP 8510 calibration kits It contains standards for measurement calibration at a 7mm reference plane Since the calibration standards are very precise great accuracy enhancement is achieved Please also refer to the operating manual for the calibration kit you will be using These are two measurements of a 1 Port device made with out accuracy enhancement and with 1 Port accuracy enhancement The uncorrected measurement uses no error correction and includes the effects of all systematic errors The second example shows results of the same measurement with frequency response directivity and source mismatch errors reduced by accuracy enhancement Four of the calibration choices are discussed in the follow ing paragraphs starting with the simplest frequency response and ending with the most complete 2 port When the calibration procedure is complete store the results in Cal Set storage location 1 through 8 When you wish to recall the stimulus settings used for the calibration simply press CAL CORRECTION ON then select the Cal Set 12 General Calibration Procedure e Set Stimulus Values Frequency Points Power Averages e Select Calibration Kit CAL then CAL1 or CAL2 e Select Calibration Type Response 1 Port 2 Port e Connect and Measure Calibration Standards Press key on Standard Selection menu standard name is underlined when measured e Save Calibration Coefficients CAL S
56. resets the HP 8510 does not issue an instrument preset to the source and other instruments on the HP 8510 system bus then recalls instrument state 8 allows you to define the instrument state recalled after you press USER PRESET Simply set all desired instrument state functions to the set tings you wish then press SAVE INST STATE 8 If you wish to define instrument state 8 to the factory preset instrument state press RECALL MORE FACTORY PRE SET SAVE USER PRESET 8 The point s at which the device under test is connected to the test set is called the Reference Plane s If cables are used to extend the test set port out to the device under test the end of the cable is defined as the Port 1 and Port 2 reference plane All measurements are made with respect to the reference plane s Here is a signal flow diagram of a typical S Parameter test set It is called a two path test set because the stimulus signal can be applied to either test set PORT 1 or PORT 2 thus allowing all four parameters of a two port test device to be measured without the need to manually disconnect and reverse the device Control of the signal path is accomplished using keys in the PARAMETER block An illustration on the test set front panel shows the signal flowgraph and lighted indicators show whether the stimulus is incident at Port 1 or Port 2 Various cables and adapters are used to connect the device to be tested to the network analyzer
57. roduct damage Warranty This Agilent Technologies instrument product is warranted against defects in material and workmanship for a period of three years from date of shipment During the warranty period Agilent Technologies will at its option either repair or replace products which prove to be defective For warranty service or repair this product must be returned to a service facility designated by Agilent Technologies Buyer shall prepay shipping charges to Agilent Technologies and Agilent Technologies shall pay shipping charges to return the product to Buyer However Buyer shall pay all shipping charges duties and taxes for products returned to Agilent Technologies from another country Agilent Technologies warrants that its software and firmware designated by Agilent Technologies for use with an instrument will execute its programming instructions when properly installed on that instrument Agilent Technologies does not warrant that the operation of the instrument or software or firmware will be uninterrupted or error free LIMITATION OF WARRANTY The foregoing warranty shall not apply to defects resulting from improper or inadequate maintenance by Buyer Buyer supplied software or interfacing unauthorized modification or misuse operation outside of the environmental specifications for the product or improper site preparation or maintenance NO OTHER WARRANTY IS EXPRESSED OR IMPLIED AGILENT TECHNOLOGIES SPECIFICAL
58. rt of the network measurements picture Measuring the transmission insertion loss and phase characteristics completes the device characterization and provides a basis for comput ing parameters such as electrical length and group delay The following paragraphs describe transmission measure ments of insertion loss insertion phase electrical length and group delay Insertion Loss and Gain are ratios of the output signal to the input signal When set up as shown below the results can be read directly in decibels Stimulus and NUMBER of POINTS as required REF_POSN 10 xt CAL 1 CALIBRATE RESPONSE Connect Thru THRU DONE RESPONSE CAL SET 2 Connect test device Select Format MARKER then position measurement marker to read measured value Calibration for insertion loss and gain sets the magnitude ratio to zero dB at all frequency points with the thru connection After connecting the test device a negative measured value indicates loss a positive measured value indicates gain This figure shows the insertion loss of a bandpass filter Parameter Format Response 22 3 dB Bandwidth 10 0 dB V_ 0 5478 de E ES hp T el MARKER 2 1 I 4 11675 GHz eh ES iL a CENTER 7 000 80000 GHz SPAN 2 5000 8000 GHz Out of Band Rejection 2 20 0 dB V 112 38 e8
59. rument state files to the HP 8510 internal disk drive or to external mass storage These steps are discussed in detail in the following para graphs RF Device Under Test Step 1 Sit log MAG REF 2 0 cB 10 0 dr Pe 1 START STOP 2345222202 GHz SQ 200200000 GHz Step 2 Test Setup Connections r Reference t j Sir Siz Test t Sar S22 Test 1 S22 Sq2 Reference f l l I ir prai i ig Porn 1_ 1 a i Tune A i Atten Biasi Port 2 Bias 2 Atten Local i 1 Diebe d 2 Oscillator 1 LA A a a A eS Selina Two Cables Network Analyzer Test Set Cable Set 53cm each 21in afb Device Under Test Single Cable Network Analyzer Test Set Test Port Adapter o Single Cable 81cm 32 in Pressing the green key initializes all HP 8510 internal functions then recalls Instrument State 8 An instrument preset command is not sent to other instruments connected to the HP 8510 system bus Unless the user has changed the contents of Instrument State 8 the CRT will appear as shown here with the current S11 measurement displayed in the logarithmic magnitude format The appearance of the trace will depend upon the actual connec tion to PORT 1 of the test set Note HP 8510C Preset operation is changed from the HP 8510B The fact that HP 8510C only p
60. s a linear phase characteristic The group delay will thus appear as a flat line This figure shows that the group delay varies as a function of frequency when the test device exhibits devia tion from linear phase Thus group delay is the transit time through the DUT as a function of frequency Mathematically it is the derivative of the phase response with respect to frequency where Ag is the difference in phase at two frequencies separated by Af The quantity Af is commonly called the aperture of the measurement gt 180 degrees between points S21 Aes bw R F 5 0 ns 1 0 ns V 2 0354 ns E hp E y T y T nan FsMO THING APERTURE i 0 V SHAN i E y E z ji T E PO A ea CENTER 7 000000000 GHz SPAN 2 500000000 GHz S21 A9 bw SMOBTHING APERTURE Y SHAN un 25 0 MHz ER o J Fees i E Xs l CENTER 7 000000008 GHz SPAN 2 500000000 GHz Group Delay Aperture The minimum aperture is the frequency step between the phase measurements You must choose this aperture when you set the frequency range and number of points so that there is no more that 180 degrees of phase shift between any of the frequency points If there is more than 180 degrees of phase shift the group delay trace will show a sudden
61. sing firmware revision 6 0 or greater along with and HP 836x family source Ramp sweep frequency accuracy is much improved over systems with HP 835x or 834x family sources due to the source network analyzer measurement trigger interface This interface lets the source control the HP 8510 by signalling when the source is at the desired measurement frequency Using this interface the HP 8510 Trim Sweep function is disabled The Step sweep mode is used when maximum frequency accuracy and repeatability are required In the Step mode the synthesized sweeper is phase locked at each frequency point before the measured data is read The tradeoff is measurement speed and frequency accuracy better frequency accuracy pro duces better measurement accuracy Because you can select either Ramp or Step after calibration you may wish to choose Step for the calibration then switch to Ramp for tuning or other DUT adjustments during the measurement then switch back to Step for the final data acquisition Source Power Level The power level of the stimulus sig nal is preset to an appropriate value for measurement of most passive device and devices with less than about 20 dB of gain In order to be absolutely certain of the RF power level avail able at the test port measure it using a power meter connected to Port 1 or Port 2 The SOURCE POWER func tion may be used to change the power available at the test port Messages will be displayed if the source pow
62. t at Port 1 SHORT DONE RESPONSE CAL SET 1 Connect test device Select Format MARKER then position measurement marker to read measured value This figure shows the return loss of a filter in the LOG MAG format A typical filter has a poor match near 0 dB outside the passband and a good match large numerical inside the passband A large numerical value for return loss for example 40 dB corresponds to a small reflected signal the reflected signal is 40 dB below the incident signal just as a large value for insertion loss corresponds to a small transmitted signal Parameter Format Response This fi shows the reflected signal viewed using the LINEAR MAGNITUDE cartesian format In this format a reflection coefficient of 1 00 means that 100 percent of the signal is reflected Inside the passband a value of 0 7 means that 70 percent of the signal is reflected 20 Measuring SWR CENTER 7 009000000 GHz SPAN 2 500000000 GHz Measuring S Parameters Sit REF 1 2 Units b 200 2 miinits Yo 212 69 mJ 4 65 hp a C a MARKER 3 6 8875 amz CENTER 7 022000000 GHz SPAN 2 500000000 GHz Measuring Impedance S11 z REF 1 0 Units k 200 0 munits V 59 652 21 676 9 hp alo MARKER 1 6 8875 CENTER 7 Q00000000 GHz SPAN 2 SOD000000 GHz 21 This figure shows the reflection measurement in terms of standing wave ratio a unitless ratio of reflected to incident signal SWR
63. t connectors and bends along a coaxial transmission line comparing responses in both the Band Pass and the Low Pass modes Then using the Band Pass mode separate the individual main leakage and triple travel transmission paths through a surface acoustic wave SAW filter This example also shows the Time Domain Gate capability The HP 8510 time domain lets you perform what if analysis by mathematically removing selected reflections and seeing the effect back in the frequency domain The time domain response of a reflection measurement is often compared with the familiar time domain reflectometry TDR measurements Like the TDR measurement it measures the size of the reflections versus time or distance Unlike the classical TDR the HP 8510 time domain capability allows you to choose the frequency range over which you would like to make the measurement In this example we measure over the full range of the example test set 45 MHz to 50 GHz comparing the responses Port 1 Setup Adapter 0 7 Meters Adapter Calibrate 2 0 Meters Measure 4 i Pfs Domain The test device is a pair of test cables shown in the figure connected by one or two adapters to make things interesting Terminate the end of the cable with a fixed load Proceed as follows to measure this device Do
64. test sets all intro duce variations in magnitude and phase that can distort the actual performance of the DUT Because the magnitude and phase of the error is unknown each error is assumed to have a cumulative effect of increasing the uncertainty of the measured data Errors that are repeatable and have effects that can be pre dicted are called systematic errors The measurement cal ibration step seeks to remove the effects of these systematic errors from the measurement of the device under test There are three categories of these systematic errors Frequency Response Tracking Leakages Mismatches Any of several calibration types can be used to measure and compensate for these test system imperfections Each method removes one or more of the systematic errors using a specific error model In the process of measurement cal ibration the user connects and measures one or more precisely known standards at the point at which the test device will be connected In principle the difference between the precisely known response of each calibration standard and the actual measured response is used to deter mine the magnitude and phase value of one of the errors Later when the device under test is connected the effects of these errors are mathematically removed and the device response is displayed with much reduced measurement uncertainty The accuracy of error corrected measurements depends on the quality of the standards used fo
65. the highest frequency in a continuous sweep Measured data is sampled at the selected frequency points without stopping the sweep Because you can select either Ramp or Step after calibra tion you may wish to choose Step for the calibration then switch to Ramp for tuning or other DUT adjustments dur ing the measurement then switch back to Step for the final data acquisition Frequency List is used to specify arbitrary frequency points for measurement Pressing FREQUENCY LIST presents a menu structure that allow you to specify unrelated single frequencies or segments For example in the application where the same number of points are measured over adja cent octaves use the key sequence shown here STIMULUS MORE EDIT LIST ADD START STOP 4 STEP SIZE DONE ADD START 4 STOP STEP SIZE DONE DUPLICATE POINTS DUPLICATES DELETED DONE FREQUENCY LIST When you press FREQUENCY LIST with more than one segment defined the menu allows selection of either ALL SEGMENTS or SINGLE SEGMENT Pressing SINGLE SEGMENT causes only the current selected seg ment to be measured Use the STEP keys knob or numeric entry to select the segment What are the Speed and Accuracy Differences Between RAMP and STEP Sweep Time In the Ramp sweep mode the Sweep Time is an important consideration when testing narrowband devices Fa
66. to 75 GHz with an HP 83xx synthesizer as the LO Load the appropriate file by pressing LOAD MORE MACHINE DUMP Use the knob to position the box around the file you wish to load Press LOAD FILE The file will be loaded and the system should begin to measure normally General Measurement Sequence User Preset or Factory Preset Connections Controls Measurement Calibration Save Instrument State Measurement Read Values Output Results Even with its wide range of capabilities the HP 8510 is easy to operate Common measurements can be set up with only a few front panel selections The following sequence is used throughout the HP 8510 user documentation to illustrate the use of the HP 8510 in its various operating modes The green key can be pressed at any time to return the HP 8510C to a user defined state The User Pre set function performs all necessary internal HP 8510C initialization then recalls Instrument State 8 If you wish to set the HP 8510 instrument state to a fully known factory defined configuration press MORE FACTORY PRESET which always initializes all system instrument state func tions to the same default conditions except for the fre quency range which depends upon the capabilities of the source and the test set FACTORY PRESET sends an instrument preset to all instruments on the HP 8510 sys tem bus then recalls the HP 8510 factory defined instrument state A table at the
67. veraging the newly acquired data with the current displayed data using the weighted expo nential running average technique Using this process the new data has relatively little effect on the existing data and n 1 sweeps where n is the averaging factor are required to produce fully averaged data The proper procedure is then if you select an averaging factor of 16 allow 17 sweeps until using the data You may use the Number of Groups function on the Stimulus menu to keep track of the sweeps by pressing STIMULUS MENU MORE NUMBER of GROUPS then 17 x1 When the H Hold annotation appears on the screen the sweep stops and data is ready In the Step sweep mode each data point is averaged as it is measured by taking n 1 measurements of that point Thus for Step sweep only one sweep is required to produce fully averaged data Select SINGLE or NUMBER OF GROUPS ED to acquire the data Cc Sy 4 M Ret 2 0 da 4 10 0 d8 e 10 033 48 log MAG 1p Step 4 Perform MeasurementCalibration MARKER 2975 GH E ae e 794 4 o o KA i CENTER 32 265975000 GHz SPAN 10 220000000 GHz o Correction n Correction Off Accuracy in network measurements is greatly influenced by factors external to the network analyzer frequency conver sion and signal processing steps Parts of the measurement setup such as interconnecting cables and

Agilent Technologies 8510C User's Manual

Contents

Download Pdf Manuals

Related Search

Related Contents