SigPOD Press
Contents
1. Press gathers information from the wizard and automatically makes modifications to the software to fit the specific customer implementation requirements The wizard provides the best of both worlds the deployment simplicity of an off the shelf solution coupled with the benefits of a custom solution tailored to your exact press monitoring requirements The best practices used by the SigPOD Press include Sciemetric s advanced signature analysis methodology Algorithms find specific features on a press waveform and conduct advanced analysis on those key features e g initial contact point point of bottom out point of absolute maximum force etc The analysis does not rely on the waveform s position on the result grid as the features are identified dynamically and the full feature characteristics are evaluated This technique yields increased accuracy and better repeatability than conventional methods Conventional press monitoring systems use basic postage stamp box function fitting window or peak detection to determine quality These older approaches collect a limited sample of data and verify that the waveform correctly enters and exits static windows on the waveform These approaches yield unreliable results as they fail to fully analyze each waveform feature OP 84 Pin o S Fat ti Force Dipin il A D al u Ej y F z A Daea Mopin frend biran Prewitum Paine Piira Diigisth Da2. depending on model 10 V 2 V 100 mV 33 mV 0 01 of full scale 16 bit A D 32 768 counts 250 kHz 10 MQ 20 kHz 6 pole and 1 kHz 4 pole selectable 20 kHz maximum 3 dB down Auto zero 28 V without damage Relay contacts per channel 10 VDC 150 mA per channel 0 01 100 uV max Continuous Separate input per channel Number of Channels Sensors Signal Type Index input Frequency Counter Input Protection Sensor Power Digital Inputs Up to 4 depending on model Rotary encoders and linear scales Quadrature input or single phase pulses Can optionally zero the counter 5 MHz maximum pulse rate TTL 50 kHz maximum pulse rate open collector internal pull up 32 bit 2 x 109 counts 28 V without damage 5V DC 250 mA current limited Warm Up Time 60 minutes for stated accuracy Paint Finish Black baked powder Power Supply Voltage 18 to 36 VDC Power Consumption 48 W maximum 30 W typical The exact processor type and speed memory supplied hard disk capacity and other technical specifications are subject to change Depends on system configuration Solutions for Manufacturing Defect Detection Analysis Traceability Number of Channels Polarity Isolation Voltage Input Current Input for low state Input for high state Digital Outputs 8 with common return line Bidirectional 240 VAC or DC Optically isolated 2 5 mA maximum 8 VDC maximum 16 VDC minimum Number o
3. direct Ethernet and most major fieldbus interfaces such as Interbus Profibus Asynchronous Testing and DeviceNet The SigPOD Press Monitoring System has advanced data whoa pgo 70 DeviceNet collection capabilities and supports completely independent casas collection of analog data from multiple rams The system Supports independent triggering and asynchronous collection Increase 1 SigPOD Test System First Time Yield The QualityWorx Test System Manager collects all test data including waveform results from a SigPOD Press test system and permanently QualityWorX features such as trend reports For each test operation the following data is stores them on the QualityWorx server Advanced What If analysis and Pareto charts provide stored and automatically sorted analysis tools are used to analyze and automatically an accurate understanding of quality and defect e complete waveforms issues Corrective action can then be taken 3 D e discrete feature data e g leak rate sort through enormous amounts of test data and to eliminate the root cause of quality problems insertion force transform the raw data into actionable information leading to increased first time yield e operation status results The QualityWorX TSM provides insight into the test data enabling an accurate understanding of defect and quality issues Corrective action can then be taken to eliminate the root cause of quality AA QualityWorX problems leading t
4. Gets ere een wd me a TM SPOD Press Monitoring System Sciemetric s SigPOD Press Monitoring System provides the easiest to use most comprehensive and highest reliability press monitoring available With the most consistent test results and less false failures the SigPOD Press will helo you achieve your yield and quality objectives Off The Shelf Solution Sciemetric s SigPOD Press Monitoring System is a proven off the shelf test system that can be quickly setup by the user and automatically configured for your specific requirements Easy Configurable Setup The system can be setup without an external computer by using the optional touch screen monitor or with the optional mouse and keyboard The setup is menu driven by a wizard that guides the user through the setup process This has the benefits of allowing for fast implementation and low start up costs Best of all the wizard configures the SigPOD Press for your specific press monitoring needs in a matter of minutes unlike other press monitoring solutions that require costly on site installation by a 3rd party Press Monitoring Best Practices The SigPOD Press comes out of the box with advanced algorithms designed for the simplest to the most complex press monitoring requirements Sciemetric has embedded press monitoring best practices into the system based on decades of experience with press applications During setup the SigPOD
5. ble and Flexible The SigPOD Press system is flexible and able to scale according to your specific requirements Multi RAM Monitoring Capability The system scales to support from one to four rams on a Single test system providing flexibility based on your production requirements Many competitive press monitoring systems can only monitor one or two rams For multi ram monitoring SPOD AE SS and analysis for up to 4 rams This leads to improved cycle time oe wee on is ies Lie Immediately after the press operation is complete for a given ram the data is analyzed and the pass fail result is transmitted without having to wait for all rams to complete their cycle Available on select models only Please consult specifications ren veo rar om nom Production Ready The SigPOD Press is ideally suited for continuous operation in HE auje S22 mE production To ensure maximum reliability and up time the SS tere Ml Src lear controller is designed to NEMA 12 IP52 standards to withstand the demands of the harshest manufacturing environments requirements you would need to buy multiple test systems from the competition whereas you can accomplish this with one SigPOD Press resulting in a lower initial capital expenditure and lower deployment costs The SigPOD test systems can be seamlessly integrated into your manufacturing process The system supports numerous communication and network options including
6. f Channels Polarity Isolation Voltage Switching Capability Contact Resistance 8 with common return line Bidirectional 240 VAC or DC Optically isolated 1 A 60 VAC peak or DC gt 100 MQ off lt 0 15 Q on Sciemetric Instruments Inc Tel 613 254 7054 www sciemetric com For more information contact your local Sciemetric Representative 2005 Sciemetric Instruments Inc All brand and product names are trademarks or registered trademarks or their respective companies Printed in Canada Rev1 0 March 2005 e mail inquiriles sciemetric com
7. ion All production facilities are subject to normal variations in operation These variances may be the result of slight differences in pallet om 6 OP 4 Pin es se me Bay Fat 14 train BB RS Poe The advanced limit management capability of the SigPOD Press allows for easier limit management and optimal limits to be set Press Monitoring System dimensions sub components or fixtures To maximize productivity it is imperative that a test system be capable of identifying and addressing normal process variability while alerting operators of abnormal or harmful variability The SigPOD Press uses Process Variability Compensation to accommodate for inevitable process variability and minimize false rejects Most press monitoring systems are triggered by an absolute Start The starting point could be a PLC trigger or when the press Starts The SigPOD Press analyses test results based on the initial point of contact between the ram and the part Over time the amount of displacement required to press a part will vary This variability would confuse other press monitoring systems into believing that less or more displacement was required depending on the pallet dimensions Press monitoring systems that rely on an absolute start require constant calibration These conventional press monitoring systems tend to generate numerous false failures and manufacturing personnel loose confidence in them Scalea
8. ip Lardi Loge Hala O EE The SigPOD Press uses Sciemetric s advanced signature analysis technology to eliminate false accepts and find more defects than other press monitoring systems Advanced Limit Management Auto Learn Any manufacturing test system is only as good as the limits that have been set If limits are set too wide then a manufacturer runs the risk of shipping faulty product If limits are too stringent then yield is compromised and manufacturing personnel loose confidence in the system Therefore SigPOD Press includes Sciemetric s proprietary Advanced Limit Management System which consists of both auto learn and maintain functions The auto learn function suggests optimal statistically derived limits for the press monitoring system Known failure rates are estimated BEFORE deployment on the factory floor As manufac turing processes experience normal process variation the limits of any press monitoring system will require maintenance to avoid creeping in to a false fail or false pass scenario Sciemetric s proprietary maintain function is designed to help in this process by using production statistics to continuously calculate optimal test limits and propose new limits that the user has the option of accepting The auto learn and maintain functions have a very significant impact on the integrity of the monitoring system and on its total cost of ownership Process Variability Compensat
9. o increased first time yield TOSE System Manager Prepp ee Sn nampa am paanan o i IM ra Tt 7 Li A 5 SPOD System Intel Celeron Processor 650 M Optional 10 4 touch screen Solid state disk technology for o Optional HD for high capacity d DIN rail Desk Machine Panel Online User s Manual Hz Microsoft Windows XPe operating system perating system and data ata storage and Arm mount Processor Processor Intel Optional Hard Disk for Data 40 GB Operating System Memory 512 MB RAM Data Memory 512 MB Ethernet 10 100 Base TX USB 2 Ports RS232 Serial Port 1 External Monitor General SVGA Connector Chassis Dimensions SigPOD only SigPOD w Screen Chassis Weight SigPOD only SigPOD w Screen SigPOD Desk Mount Operating Humidity Operating Temperature Environmental 7x7 7 4x4in 178x197x101 mm HxWxD 8 3x11 5x5 8 in 211x292x147 mm HXWxD 5 Ibs 2 3 kg 11 Ibs 5 kg 17 Ibs 7 7 kg 8 to 90 relative non condensing 5 to 45 C NEMA 12 IP52 with NEMA Hood Analog Inputs Specifications and Ordering Information Number of Channels Input Ranges Input Accuracy Resolution Maximum A D Sample Rate Input Impedance Input filter Input Bandwidth Internal Calibration Overload Protection Shunt Calibration Excitation Voltage Maximum Current Line and load regulation Noise Short Circuit Protection Excitation remote sense Encoder Input Up to 4
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