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601-279D - NSG 3040 User Manual english.indd

1. 66 NSG 3040 EMC test system 67 0096 NA ol ZH 540612 000000L 00000L 0000L 000L 00L SA m LO 0 1 LO sto szo SLO L szQ Sen s Sp L S o oa SL a sz 1 se z ss 001 SG SOL 507 0001 5072 DJ a 0000L dul 00000L TA3SEO Advanced Test Solutions for EMC 68 8 4 Combination wave Surge parameter setting The surge test generates high voltage pulses as specified in the international standards EN IEC 61000 4 5 8 4 1 Test configuration for power line coupling Test pulses are injected directly into the EUT power supply lines as they pass through the mains CDN s The EUT obtains its power from the EUT power outlet on the front panel of the CDN where the mains voltage has the interference signal Superimposed on it 8 4 2 Test configuration for external coupling In this mode the interference pulses are switched to the surge Hi and Lo output sockets on the fron connected By usin pose the interferen cables and other ki t panel to which an external data line signal coupler can be g such an external signal coupler it is possible to superim ce signal as specified in the standards on communication nds of data lines The same coaxial HV output sockets may also be used for connection to all
2. V NSG 3040 touch touch screen keys and wheel CAUTION Never use a metal sharp or pointed tool for H touching the panel Use a soft towel for cleaning Never use aggressive cleaning liquids As soon the unit is powered and switched on the boot procedure starts approx 30 s and the Start menu is displayed TASEO Advanced Test Solutions for EMC 34 g TASEO Advanced Test Solutions for EMC ESD simulators compact user friendly and ready for tomorrow s standards Air and contact discharge operation 200V to 30kV Touch screen display 8 battery Compliant with industry standards IEC ANSI SAE ISO etc Interchar network modules Loading system parameters please wait SUI boot up screen 7 1 Main menu THSEO Advanced Test Solutions for EMC ua v M e rei 2 M A EE E D pras INTERLOCK EI Main menu The main menu is displayed following boot up The main menu shows the pos sible pulses or tests which are available to the user depending on the NSG 3040 s configuration Faded generator icons Telecom 10 700 Us pulse and voltage variation mean that the generator is configured to generate those pulses but the proper unit is not connected The empty buttons are reserved for future applications Inthe red bar there are three buttons System Reset Interlock and Remote Touching the reset interlock button will close the interlock The interlock link
3. General settings window when automated variac is connected Beeper volume During the surge test there is a beep sound to alert the user Touch the beeper volume button On in the example to switch the sound on and off Default will be always Beep On for safety purpose The red vertical bar on the right side of the General settings window displays 4 buttons Exit EUT OFF ON Factory Settings and OK EXIT Touch the Exit button to return to the system window without saving set tings NSG 3040 EMC test system EUT OFF ON The EUT on off button is used only when an option with a built in EUT switch such as an INA 6502 a CDN 3043 or a VAR 3005 is connected to the NSG 3040 The NSG 3040 itself does not a CDN 3043 have an EUT switch Touching the button will turn the EUT switch on or off FACTORY SETTINGS Touch the Factory settings button to reset the properties associated with each of the buttons in the general settings window to the original factory settings OK Touch the OK button to save all settings and return to the system window Interlock action Touch the Interlock action button EUT Power on in the example to keep EUT power on when the interlock is activated or to have it automatically shut off EUT Power off when the interlock is activated Expert mode Touch the expert mode button Off in the example to Active to change parameters d
4. NSG 3040 EMC TEST SYSTEM USER MANUAL 601 279D advanced Test Solutions for EMC NSG 3040 EMC TEST SYSTEM USER MANUAL CONTENTS 2 1 3 1 3 2 33 3 4 3 5 3 6 4 1 4 2 4 3 4 4 4 5 4 6 4 7 5 1 5 2 9 3 5 4 6 1 6 1 1 6 1 2 6 1 3 Explanation of symbols Introduction General description Standards and applications ESD test Burst test Combination wave test Mains quality test Magnetic fields with mains frequency option Pulsed magnetic fields option Safety instructions General nstallation nstallation of an EUT power switch Applicable safety standards Test execution User warnings Generator Dangers concerning the EUT First steps nstallation of the NSG 3040 system Connecting the test system to the ground reference plane ounting in a 19 rack Rear ground brackets INA 165 Mainframe description Front panel EUT output Reference ground connector Surge output 10 10 12 12 12 13 14 14 14 15 15 16 17 17 18 19 20 21 22 23 23 23 24 24 24 25 26 6 1 4 6 1 5 6 1 6 6 2 6 2 1 6 2 2 6 2 3 6 2 4 6 2 5 6 2 6 7 1 1 2 73 74 75 7 6 7 6 1 7 6 2 7 6 3 7 6 4 7 6 5 7 6 6 df 1 7 1 LAD 78 8 1 8 2 8 2 1 8 2 2 8 2 3 8 3 8 3 1 Burst output ndicator LEDs Touch screen and user interface Rear panel nstrument supply EUT power input DC EUT input Ground connection point System interface connector 25 pin D sub Synchro B
5. TASEO Advanced Test Solutions for EMC 102 11 5 NSG 3040 DDV DDV stands for Dips Drops and Variations NSG 3040 DDV is a single function generator made for Dips Drops and Varia tions testing NSG 3040 EMC test system For drops and variations testing a variable voltage source is required 103 This is available from Teseq in different variations as accessories INA 6501 Manual step transformer INA 6502 Automatic step transformer VAR 3005 S16 Automatic variac VAR 3005 D16 Automatic double variac See section accessories for more information TASEO Advanced Test Solutions for EMC w 12 MAINTENANCE AND FUNCTION CHECK Pm 12 1 General Inside the test system there are no adjustable elements accessible to the user neither for calibration nor for maintenance purpose The housing of the test system must not be opened exceptional for SW update via SD card Should any maintenance or adjustment become necessary the whole test system together with an order or fault report should be sent in to a Teseq service center Maintenance by the user is restricted to cleaning the outer housing performing a function check and verification of the pulse parameters The only exception concerns the exchange of modules or the upgrading of the system with new modules In such cases the instructions accompanying the modules are to be strictly observed 12 2 Cleaning n general a moist cloth is sufficient
6. a bench top unit It can be used with Teseq s NSG series or any industry stan dard surge generator with the appropriate connector adapter NSG 3040 EMC test system Technical specifications Parameter Max operating voltage Max operating current Ohmic resistamce per path Decoupling chokes 1 KHz Pulse Max pulse voltage Accessories Resistor networks Coupling adapters 153 CO Value AC 250 V DC 250 V 0 5A 30 20 mH nominal 1 2 50 and 10 700 us pulse 6 6 kV line to ground 3 kV line to line INA 172 4x1000 6W INA 175 4x 160 Q 6 W INA 170 Sparkling gap device 90 V trip voltage INA 171 Capacity 0 1 uF spark gap device 90 V trip voltage INA 173 Short circuit connector TASEO Advanced Test Solutions for EMC 154 14 7 Measuring accessories 14 7 1 MD 200 and MD 200A differential high voltage probes The Teseq MD 200 and MD 200A high voltage differential probes are ideally suited to allow EMC engineers to verify their conducted EMC test generators periodically Their performance permits to be used for many other purposes where higher voltages have to be measured in a potential free manner Annual calibration and periodic verification The annual calibration of test equipment recommended by most of the qual ity systems ISO 9000 ISO 17025 etc has to be considered as a validation of all measurements done since the last calibration any EMC standards call for a
7. gt N 60 s 10 pulse 2 4 1000 V 2 0 2707 90 L gt N 60 s 10 pulse 3 4 2000 V 2 0 2707 90 L gt N 60 s 10 pulse 4 4 4000 V 2 0 270 90 L gt N 60 s 10 pulse IEC 1PH POWER LINES L PE LEVEL 1 11 500 V 12 0 270 90 L gt PE 60s 10 pulse IEC 1PH POWER LINES L PE LEVEL 2 1 2 500 V 12 0 270 90 L gt PE 60 s 10 pulse 2 2 1000 V 12 0 2707 90 L gt PE 60 s 10 pulse IEC 1PH POWER LINES L PE LEVEL 3 1 3 500 V 12 0 270 90 L gt PE 60 s 10 pulse 2 3 1000 V 12 0 2707 90 L gt PE 60 s 10 pulse 3 3 2000 V 12 0 2707 90 L gt PE 60 s 10 pulse IEC 1PH POWER LINES L PE LEVEL 4 1 4 500 V 12 0 2707 90 L gt PE 60 s 10 pulse 2 4 1000 V 12 0 2707 90 L gt PE 60 s 10 pulse 3 4 2000 V 12 0 2707 90 L gt PE 60 s 10 pulse 4 4 4000 V 12 0 270 90 L gt PE 60s 10 pulse IEC 1PH POWER LINES N PE LEVEL 1 11 500 V 12 0 270 90 N gt PE 60s 10 pulse IEC 1PH POWER LINES N PE LEVEL 2 1 2 500 V 12 0 270 90 N gt PE 60s 10 pulse 2 2 1000 V 12 0 270 90 N gt PE 60s 10 pulse IEC 1PH POWER LINES N PE LEVEL 3 1 3 500 V 12 0 270 90 N gt PE 60s 10 pulse 2 3 1000 V 12 0 270 90 N gt PE 60s 10 pulse 3 3 2000 V 12 0 270 90 N gt PE 60s 10 pulse IEC 1PH POWER LINES N PE LEVEL 4 1 4 500 V 12 0 270 90 N gt PE 60s 10 pulse 2 4 1000 V 12 0 270 90 N gt PE 60s 10 pulse 3 4 2000 V 12 0 270 90 N gt PE 60s 10 pulse 4 4 4000 V 12 0 2
8. 12 0 270 7 90 N gt PE 60s 10 pulse IEC 3 PH POWER LINE LX PE LEVEL 1 1 4 500 V 30 0 270 90 L1 gt PE 60 s 10 pulse 2 4 500 V 30 0 270 90 L2 gt PE 60s 10 pulse 3 4 500 V 30 0 270 90 L3 gt PE 60s 10 pulse 4 4 500 V 30 0 270 7 90 N gt PE 60s 10 pulse IEC 3 PH POWER LINE LX PE LEVEL 2 1 4 1000 V 30 0 270 90 L1 gt PE 60s 10 pulse 2 4 1000 V 30 0 270 90 L2 gt PE 60s 10 pulse 3 4 1000 V 30 0 270 7 90 L3 gt PE 60 s 10 pulse 4 4 1000 V 30 0 270 90 N gt PE 60s 10 pulse IEC 3 PH POWER LINE LX PE LEVEL 3 1 4 2000 30 0 2707 90 L1 gt PE 60s 10 pulse 2 4 2000 V 30 0 270790 L2 gt PE 60s 10 pulse 3 4 2000 V 30 0 270 90 L3 gt PE 60s 10 pulse 4 4 2000 V 30 0 270 90 N gt PE 60s 10 pulse IEC 3 PH POWER LINE LX PE LEVEL 4 1 4 4000 V 30 0 270 7 90 L1 gt PE 60s 10 pulse 2 4 4000 V 30 0 270 90 L2 gt PE 60s 10 pulse 3 4 4000 V 30 0 270 90 L3 gt PE 60s 10 pulse 4 4 4000 V 30 0 270 7 90 N gt PE 60s 10 pulse NSG 3040 EMC test system IEC DC LINES L N 12 R LEVEL 1 1 1 500 V 12 Asynch L1 gt N 60 s 10 pulse IEC DC LINES L N 12 R LEVEL 2 1 2 500 V 12 Asynch L1 gt N 60 s 10 pulse 2 2 1000 V 12 Asynch L1 gt N 60 s 1
9. 2 meter Input cable NSG 3000 standard cable to be used Installation connection to NSG 3000 series The equipment should be switched off during installation and inter connection m Connect INA 6501 EUT power out to NSG 3040 EUT power input EJ Connect INA 6501 EUT power in to mains using EUT power in cable delivered with NSG 3040 of NSG 3040 earth leakage currents of up to 4 A can occur in the EUT power supply network The test system must therefore be correctly earthed and be powered from a supply that is not protected by a residual current detector RCD Because of the capacitors in the internal coupler m Switch on EUT power on INA 6501 red switch when power for the EUT is required H Switch on the NSG 3040 E Select the required variable voltage using rotary switch on the INA 6501 NSG 3040 EMC test system Operation 127 The NSG 3040 operation software does not know that an external transformer is connected The user interface software in the dips and drops test will al ways show External in the field for Voltage Uvar It is up to the user to make sure that the right voltages are set on the manual external transformer Dips and Drops test Voltage Uvar _a External Phase R 0 smen T Event __ 10 ms Repetition Step unnan Time wl Duration 3 rue 7 14 3 4 Manual step transformer INA 6502 The step transformer type INA 6502 is a standard accessory for the Schaffner NSG 3
10. L2 L3 N PE 750us 1300 ms 120s ANSI IEC CAP COUPL LEVEL 1 1 2 250 V 5 kHz Asynch Burst output 15 ms 300 ms 120 s 2 2 250 V 100 kHz Asynch Burst output 750us 300 ms 120 s ANSI IEC CAP COUPL LEVEL 2 1 2 500 V 5 kHz Asynch Burst output 15 ms 300 ms 120 s 2 2 500 V 100 kHz Asynch Burst output 750us 300 ms 120s ANSI IEC CAP COUPL LEVEL 3 1 2 1000 V 5 kHz Asynch Burst output 15 ms 300 ms 120 s 2 2 1000 V 100 kHz Asynch Burst output 750us 300 ms 120 s ANSI IEC CAP COUPL LEVEL 4 1 2 2000V 5 kHz Asynch Burst output 15ms 300 ms 120s 2 2 2000 V 100 kHz Asynch Burst output 750us 300 ms 120 s 79 80 Basic Standard IEC 61000 4 5 File name implemented Polarity Impedance Phase Test duration 0 270 90 IEC 1PH POWER LINES L N LEVEL 1 2 0 270 90 10 pulse IEC 1PH POWER LINES L N LEVEL 2 2 0 270 90 10 pulse 2 0 270 90 10 pulse IEC 1PH POWER LINES L N LEVEL 3 2 0 270 90 10 pulse 2 0 270 90 10 pulse 2 0 270 90 10 pulse IEC 1PH POWER LINES L N LEVEL 4 2 0 270 90 10 pulse 2 0 270 90 10 pulse 2 2 10 pulse IEC 1PH POWER LINES L PE LEVEL 4 0 270 90 10 pulse IEC 1PH POWER LINES L PE LEVEL 1 0 270 90 10 pulse IEC 1PH POWER LINES L PE LEVEL 2 0 270 90 10 pulse 0 270 90 10 pulse IEC 1P
11. The DC current capability derating is given by the specification of the circuit breaker used to switch EUT power ON and OFF In case this internal EUT power ON OFF function is not used the DC current full range can be used for up to 350 VDC NSG 3040 EMC test system Name Max Cur EFT Cou Combined Ring wave rent A pling wave surge surge coupling coupling CDN 3063 B16 690 16 x CDN 3063 S16 690 16 x x CDN 3063 C16 690 16 X x x CDN 3063 B32 690 32 X CDN 3063 S32 690 32 x x CDN 3063 C32 690 32 X x x CDN 3063 S63 690 63 x x CDN 3063 S100 690 100 x x Other and special versions of CDN 3043 or CDN 3063 models are available on request Contact your Teseq sales contact for more info TASEO Advanced Test Solutions for EMC 114 14 3 Variable voltage sources 14 3 1 Automatic variacs VAR 3005 is a dual voltage source to be driven by Teseq NSG 3000 series of EMI test generators which provides the two supply sources required to test equipment with universal power supplies one source providing the test volt age the other providing the variable voltage required for dips and variation testing VAR 3005 is based on variac technologies as recommended by IEC 61000 4 11 The 2 variacs are driven by a motor the whole controlled by a processor based servo control which reaches great accuracy and adjusting speed per formance VAR 3005 series are controlled by the user i
12. must be closed before starting a test NSG 3040 EMC test system Touch Remote button to enter remote controlled screen No inputs via touch 35 panel are possible The NSG can now be controlled via WIN 3000 remote control software Touch Exit on screen and in WIN 3000 to use NSG manually 7 2 System window Touch the System button to display the System window System window System window The System window displays 6 buttons General Equipment Communication Monitoring SD card properties and language In the red bar there are two buttons Factory settings and exit FACTORY SETTINGS Touch the Factory settings button to reset the properties associated with each of the buttons in the system window to the original factory settings EXIT Touch the Exit button to return to the main menu 7 3 General settings Touch the General button to display one of the following windows General settings Beeper volume On Expert mode Off General settings window when no optional hardware CDN variac etc connected TASEO Advanced Test Solutions for EMC 36 General settings Beeper volume EUT OFF Interlock action Expert mode FACTORY SETTINGS M A B General settings window when an EUT power switch has been detected General settings Beeper volume Off voltage 230 d aen Interlock action SEN Expert mode D FACTORY SETTINGS
13. not need or even not want any User interface SUI on the instrument front panel Care has to be taken at first installation as WIN 3000 needs proper installation on the drive PC The setting of the Interfaces needs to be done properly For this consult the documents in pdf format available on the CD delivered with the instrument 601 326B NSG unit amp WIN 3000 Installation Quick installation guide english pdf NSG 3040 EMC test system Refer to sections 1 2 3 4 and 5 of this document 101 The factory setting of NSG 3040_ERC series is IP address 10 10 10 10 SubNet 255 0 0 0 Port 1025 is IP address 10 10 10 10 SubNet 255 0 0 0 Port 1025 Care has to be taken to remember the new settings if these get changed H WARNING The factory setting of NSG 3040_ERC series Forgotten IP settings can only be resetted in Teseq service centers Therefor it is strongly recommended to leave the factory set IP and to install INA 3011 option on the user PC The second IP address dedicated to the NSG 3040 control may be set to the fix IP address 10 10 10 11 refer to quick installation guide and so will not interfere with the PC network settings C 11 4 NSG 3040 xxx EPO series EPO stands for Exclusive Pulse Output These special versions are made for the users who use the instrument together with an external CDN from the CDN 3043 3063 or 3083 range in which case they may not need the Build in single phase CDN 3041
14. sions of IEC 61000 4 11 2004 VAR 6503 is fitted with carrying handles as part of its overall good ergonomic design which makes for ease of handling Further the unit may be used in any of three operating positions laying or standing on a work bench or for more permanent applications it can be wall mounted NSG 3040 EMC test system Care has to be taken in case of use in standing position 121 gt as the stability is limited The cabling connecting VAR 6503 to mains and Modula presents a risk of being unvoluntarly caught by the users and causing the VAR 6503 to fall down The few control elements are readily accessible on the front panel An EUT power on off switch with a power on indicator and a large rotary knob to set the necessary voltage ensure easy and intuitive operation Two safety banana sockets provide a convenient means to connect an exter nal DVM for more accurate voltage setting The unit has been designed for use in rugged industrial environments Profes sional quality connectors ensure user safety additional system protection is provided by an 8 A fuse located in the front panel Circuit diagram VAR 6503 VARIAC s1 EN Jee LE 1 Li black bere LE Gs black 1 L I I I I I Di banana black brown 3 I Le Lvar i Si Is 2 blue P GC banana blue blue 2 l i J PE YeiGr YelGr PE TASEO Advanced Test Solutions for EMC 122 Technical specifications VAR 6503 Parameter I
15. 100 A series CDN 3063 690 series for 690 V AC Variable voltage source Automatic variacs NSG 3040 EMC test system 91 92 92 93 93 93 94 95 97 97 97 98 99 99 99 99 101 102 104 104 104 105 105 106 107 108 108 109 110 111 112 114 114 14 3 2 Manual varicas VAR 6503 120 14 3 3 Manual step transformer INA 6501 123 14 3 4 Manual step transformer INA 6502 127 14 4 agnetic field options 133 14 4 1 anual solution MFO 6501 137 14 4 2 Automatic solution MFO 6502 141 14 5 Pulse wave shape adapter INA 752 146 14 6 Coupling decoupling networks for data lines 148 14 6 1 Burst EFT coupling clamp NSG 3425 and safety cover INA 3825 148 14 6 2 Surge CDN for unsymetic datalines CDN 117 151 14 6 3 Surge pulse CDN for hi speed datalines CDN 118 152 14 7 easuring accessories 154 14 7 1 MD 200 and MD 200A differential high voltage probes 154 14 7 2 MD 300 surge pulse current probe set 156 14 73 Burst EFT pulse verification kit 158 14 8 Cables plugs and adapters 159 14 8 1 Calibration adapters 159 14 8 2 Test adapters 160 14 8 3 Various cables and plugs 161 14 9 INA 3000 Trolley 163 14 10 Rack mounting brackets 163 15 System description 164 16 Addresses 166 TASEO Advanced Test Solutions for EMC WARNING Lethal danger from high voltages and the risk of radiating illegal electromagnetic interference This system must be used only for EMC test purposes as specified in these operating instructi
16. 1000 V 2 Asynch UT gt N 60 s 10 pulse TEC DC LINES L N LEVEL 3 1 3 500 V 2 Asynch UT gt N 60s 70 pulse ER 1000 V 2 Asynch UT gt N 60s 70 pulse 38 2000 V 2 Asynch LI gt N 60s 70 pulse TEC DC LINES L N LEVEL 4 1 4 500 V 2 Asynch Lt gt N 60 s 70 pulse 2 4 1000 V 2 Asynch Lt gt N 60s 70 pulse 34 2000 V 2 Asynch UT gt N 60s 10 pulse 44 4000 V 2 Asynch L1 gt N 60 s 10 pulse NSG 3040 EMC test system IEC UNSH UNSYMM FO LINES LEVEL 1 1 1 500 V 2 Asynch Surge Output 60 s 10 pulse TEC UNSH UNSYMM FO LINES LEVEL 2 1 2 500 V 2 Asynch Surge Output 60s 10 pulse ER 1000 V 2 Asynch Surge Output 60 s 10 pulse TEC UNSH UNSYMM FO LINES LEVEL 3 1 3 500 V 2 Asynch Surge Output 60s 10 pulse ER 1000 V 2 Asynch Surge Output 60 s 10 pulse 38 2000 V 2 Asynch Surge Output 60 s 10 pulse TEC UNSH UNSYMM FO LINES LEVEL 4 1 4 500 V 2 Asynch Surge Output 60s 10 pulse 2 4 1000V 2 Asynch Surge Output 60s 10 pulse 3 4 2000 V 2 Asynch Surge Output 60s 10 pulse 4 4 4000 V 2 Asynch Surge Output 60s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 1 1 1 500 V 2 Asynch Surge Output 60s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 2 1 2 500 V 2 Asynch Surge Output 60s 10 pulse ER 1000 V 2 Asynch Surge Output 60s 10 pulse IEC
17. 4 1 2 2000 V 5 kHz Asynch Burst output 15 ms 300 ms 120s 2 2 2000 V 100 kHz Asynch Burst output 750us 300 ms 120s Basic Standard IEC 61000 4 4 2004 Ed_2 Test Test Frequenc Burst Rep duratio File name implemented step Voltage Polarityjy Phase Coupling time _ time n ANSI IEC 1PH POWER LINES LEVEL 1 1 2 500 V 5 kHz Asynch L N PE 15 ms 300 ms 120s 2 2 500 V 100 kHz Asynch L N PE 750us 1300 ms 120s ANSI IEC 1PH POWER LINES LEVEL 2 1 2 1000 V 5 kHz Asynch L N PE 15 ms 300 ms 120s 2 2 1000V 100 kHz Asynch L N PE 750us 300 ms 120 s ANSIIEC 1PH POWER LINES LEVEL 3 1 2 2000 V 5 kHz Asynch L N PE 15ms 300 ms 120 s 2 2 2000V 100 kHz Asynch L N PE 750us 300 ms 120s ANSIIEC 1PH POWER LINES LEVEL 4 1 2 4000 V 5 kHz Asynch L N PE 15 ms 300 ms 120 s 2 2 4000 V 100 kHz Asynch L N PE 750us 300 ms 120 s ANSI IEC 3PH POWER LINES LEVEL 1 1 2 500 V 5 kHz Asynch L1 L2 L3 N PE 15 ms 300 ms 120 s 2 2 500 V 100 kHz Asynch L1 L2 L3 N PE 750us 1300 ms 120 s ANSI IEC 3PH POWER LINES LEVEL 2 1 2 1000V 5 kHz Asynch L1 L2 L3 N PE 15ms 1300 ms 120s 2 2 1000 V 100 kHz Asynch L1 L2 L3 N PE 750us 1300 ms 120 s ANSI IEC 3PH POWER LINES LEVEL 3 1 2 2000V 5 kHz Asynch L1 L2 L3 N PE 15ms 300 ms 120 s 2 2 2000V 100 kHz Asynch L1 L2 L3 N PE 750us 1300 ms 120 s ANSI IEC 3PH POWER LINES LEVEL 4 1 2 4000 V 5 kHz Asynch L1 L2 L3 N PE 15ms 1300 ms 120s 2 2 4000V 100 kHz Asynch L1
18. 7 Switch the system on and operate as instructed in this manual free space around the cooling air inlets on both sides NOTE Place the test system so that there is sufficient and behind the fan outlet on the rear panel NSG 3040 EMC test system 5 2 Connecting the system to the ground reference plane For burst tests the generator must be placed on a ground reference plane which is connected to ground A good high frequency ground connection between the test system and the ground reference plane GRP is absolutely essential for performing burst tests correctly Connect the ground terminal on the front panel of the NSG 3040 to the ground reference plane using the link and bolts supplied If a CDN is connected please refer to section Reference ground connector 5 3 Mounting in a 19 rack When the NSG 3040 test system is combined with other equipment it can be useful to mount the instrument in a 19 rack The unit is 19 wide and 5U in height An optional rack mount INA 166 kit is available 5 4 Rear ground brackets INA 165 Rear ground brackets are optionally available to position the NSG 3040 securely without damaging the connectors when it must be placed with the rear panel on the floor with easy access to the touch screen These brackets guarantee a solid ground connection to a the GRP The stable housing construction allows the operator to make use of both back brackets as well as the handles TASEO Advance
19. CO CO Go F o needs to be switched via the instrument nt panel or WIN 3000 tware This allows dual rive as then the EUT ower can be switched F and ON either from Ka O tware control or from his external signal drive NSG 3040 EMC test system Pin Sync line Signal Remark Working direction 16 Sync6 High voltage ON Output is High when HV is Output to drive INA active 3001 warning lamps Internal usage 3 Sync7 Reserved debug mode 2 8 GND Sync bus ground return 15 20 y 8 1 9 24 V Interbus 24 V suppl 14 21 SES 19 Interlock return Interlock return line All Interbus lines others See chapter System interface connector functions for more detail 6 2 6 Synchro Bus system This connection includes external device control and interlock capability If the NSG is used only as a stand alone unit the termination connector needs to be plugged otherwise the unit will not start All connected accessories will be detected automatically Written tests are linked with this accessories so if other accessory is connected it may get an error if the test contains not the suitable accessories Any automated CDN and complementary automated equipment like variac step transformer etc need to be linked together Thereby the termination connector needs to be moved to the system output plug of the last
20. EMC test system It is therefore highly recommended that the EMC test engineer periodically verifies his test equipment in order to ensure good functionality and accuracy and hence minimise the risk of bad measurements and the need for a product re call Periodic verification can be done before a test session or once a day or week or month this is up to the user to decide Only a few points need to be checked which will take only a few minutes if the right test equipment is available The Teseq CAS 3025 comprises two termination attenuators INA 265B and INA 266A Plus a coaxial RG58 cable and calibration certificate indicating the precise ratio The whole is delivered in a handy case Technical specifications INA 265B termination attenuation typical 50 Q 1 1000 INA 266A termination attenuation typical 1000 Q 1 2000 Bandwith 400 MHz Max input burst peak voltage 8800 V peak Operating temperature 10 to 40 C Dimensions LxWXH 280 x 230 x 85 mm Weight 900 g approx 14 8 Cables plugs and adapters 14 8 1 Calibration adapters INA 3237 BURST EFT calibration adapter to con former INA 6561 nect NSG 3040 and CDN 3061 series second edition and later to calibra tion terminator attenuator CAS 3025 TASEO Advanced Test Solutions for EMC 159 160 INA 3236 HV plug adapter set for NSG 3000 se former INA 6560 ries Surge out to safety Banana 1 plug to RED banana 1 plug to Black banana Required for surge p
21. Nordstrasse 11F 4542 Luterbach Switzerland declares that the following product NSG 3040 Multifunction Generator all conforms to the following Directives and Regulations EMC Directive 2004 108 EEC LVD Directive 2006 95 EEC EN61326 1 2005 EN61326 2 1 2005 EN61010 1 2001 The relevant technical file is available for inspection N EMC_NSG3040_2008 LVD_NSG3040_2008 Teseq AG CH 4542 Luterbach The purpose of this instrument is the generation of defined interference signals for EMI immunity testing Depending on the arrangement of the test rig the configuration the cabling and the properties of the EUT itself a significant amount of electromagnetic radiation may result that could also affect other equipment and systems The user himself or herself is ultimately responsible for the correct and controlled operation of the rig In case of doubt the tests should be carried out in a Faraday cage European representative Place and Date Teseq GmbH Landsberger Str 255 12623 Berlin Germany Luterbach May 15 2008 aS 4 o RORY Johannes Schmid President TASEO Advanced Test Solutions for EMC 108 O 14 ACCESSORIES 14 1 PC software WIN3000 WIN 3000 remote software is a comprehensive program designed to create test libraries for the surge burst PQT and magnetic field tests that can be performed with Teseq s NSG 3000 generator series and its accessories WIN 3000 comes on a CD included in each NS
22. POWER LINE N PE LEVEL 3 13 500V 20 ohm 0 270790 N gt PE 60s 10 pulse 2 3 1000 V 300 0 270790 N gt PE 60s 10 pulse 373 2000 V 0 0 270790 N gt PE 60s 10 pulse TEC 1 PH POWER LINE N PE LEVEL 4 1 4 500 V P 20 ohm 0 270790 N gt PE 60s 10 pulse 2 4 1000 V 0 0 270790 N gt PE 60s 10 pulse 3 4 2000 V 300 0 270790 N gt PE 60s 10 pulse 20 4000 V 20 ohm 0 270790 N gt PE 605 10 pulse IEC 3 PH M FEEDER LINE LX LX LEVEL 1 1 6 250 V 12 0 270 90 L1 gt N 60s 10 pulse 2 6 250V 12 0 270780 L2 gt N 60s 10 pulse 3 6 250V 12 0 270790 L3 gt N 60 s 10 pulse 4 6 250 V 12 0270780 L1 gt L2 60 s 10 pulse 5 6 250 V 12 0 270790 L1 gt L3 60 s 10 pulse 6 6 250V 12 0 270790 2 gt L3 60 s 10 pulse TEC 3 PH M FEEDER LINE LX LX LEVEL 2 1 6 500 V 12 0 270780 1 gt N 60s 10 pulse 2 6 500V 12 0 270790 L2 gt N 60 s 10 pulse 3 6 500V P 12 0 270780 L3 gt N 60s 10 pulse 4 6 500V 12 0 270790 1 gt L2 605 10 pulse 5 6 500V 12 0 270790 LT gt L3 60s 10 pulse 6 6 500 V 12 0 270790 2 gt L3 60s 10 pulse TEC 3 PH M FEEDER LINE LX LX LEVEL 3 1 6 1000 V 12 0 270780 L1 gt N 60s 10 pulse 2 6 1000 V 12 0 270790 L2 gt N 60s 10 pulse 3 6 1000V 12 0 270780 L3 gt N 60s 10 pulse 4 6 1000 V 12 0 270790 L1 gt L2 60 s 10 pulse 5 6 1000V 12 0270780 L1 gt L3 60 s 10 pulse 6 6 1000V 12 0 270790 L2 gt L3 60
23. The zero cross reference for synchronization purpose is taken all the time from La to N EUT mains input H 1La Phase black H 3Lb Variable voltage pole red or brown H 2N Neutral blue H 4 GND Earth green yellow Wire colors and functions Black Phase conductor La Pin 1 Blue Neutral return N Pin 2 Red or brown Variable voltage pole Lb Pin 3 Green yellow Ground conductor PE Pin 4 NSG 3040 EMC test system 30 29 25 20 H Wire 2 5 mm H Wire 1 5 mm Operating current VK E Wire 1 0 mm 20 40 60 80 100 120 C Ambient temperature The additional variable voltage pole contact Lb No 3 enables a variac or alter native source to be connected for PQT tests occur on these power lines Such voltages can under certain circumstances destroy power supplies It is the user s responsibility to provide adequate protection at the source input W WARNING Pulse overshoot spikes of up to 630 V can currents of up to 4 A the EUT power supply network The test system must therefore be properly grounded and powered from a supply that is not protected by a residual current detector RCD M Capacitors in the coupler can cause ground leakage The power source to this connector provides the power for the EUT Burst and surge interference signals are coupled into this supply line internally Power is also deliv
24. To find your local partner within Teseq s global network please go to www teseq com Manufacturer Teseq AG 4542 Luterbach Switzerland T 41 32 681 40 40 F 41 32 681 40 48 sales teseq com France Teseq Sarl T 33 139 47 42 21 F 33 13947 4092 francesales teseq com Japan Teseq K K T 81 3 5725 9460 F 813 5725 9461 japansales teseq com Switzerland Teseq AG T 41 32 681 40 50 F 41 32 681 40 48 sales teseq com UK Teseq Ltd T 44 845 074 0660 F 44 845 074 0656 uksales teseq com March 2012 Teseq Specifi cations subject to change without notice Teseq is an ISO registered company Its products are design ed and manufactured under the strict quality and environmental requirements of the ISO 9001 This document has been carefully checked However Teseq does not assume any liability for errors or inaccuracies
25. Up and Down arrows to scroll through the list 7 5 Communication Communication ale 172 20 65 32 SubNet 255 0 0 0 Port 1025 Gateway 0 0 0 0 MAC Address 00 0C D2 00 03 57 FACTORY SETTINGS ray Communication window NSG 3040 EMC test system Touch the Communication button to view and enter the network address information required to integrate the NSG 3040 into a local area network or connect it to a PC By touch the IP address SubNet Port or Gateway field the key board will appear and the new numbers can be added To enter a new address only the number key and the dot may be used After touching ENTER the keypad will close and the new setting are saved The Delete key will delete all text entered The backspace button lt will delete the last letter entered Touch the Cancel button to return to the test parameter window without saving the file IP address An IP address Internet protocol address is a unique address that certain elec tronic devices use to identify and communicate with each other on a computer network utilizing the Internet Protocol standard IP Any participating network device must have its own unique address Touch the IP address button to enter the IP address A red frame will be displayed around the field Enter the IP address using the wheel or keypad Subnet A subnet is a logical grouping of connected network devices which is used t
26. for cleaning the outer housing includ ing the touch panel If necessary add a small amount of a mild non foaming household cleanser No chemicals acid etc should be used for cleaning purposes Before beginning to clean the test system ensure that it is switched off and the mains power cable is unplugged from the supply NSG 3040 EMC test system 12 3 Function check 105 The safety measures described previously must be strictly observed while carrying out a function check AS soon as the test system is switched on the Power LED should light up If this is not the case then please check the mains power connection to the test system as well as the fuses voltage selector and any other cabling The instrument automatically carries out a diagnostic routine once it has been successfully switched on The generator cannot perform any test while the interlock circuit is open Pulse generation can be observed at the output connectors by means of an oscilloscope This is a practical way to check that the system is functioning correctly but should never be used for reference or calibration purposes Do not connect the oscilloscope directly in order not to gt exceed its max input voltage Teseq recommends the use of a HV differential probe type MD 200 or MD 200A along with the INA 6560 safety banana adapter as well as CAS 3025 and MD 300 See paragraph accessories 12 4 Calibration The combination of high voltages and high
27. in the field for voltage Uvar It is up to the user to make sure that the right voltages are set on the manual external variac Dips and Drops test Voltage Uvar d External Phase z 0 synen Tevent 10 ms Repetition Step as Time 10 3 Duration 3 ru v 14 3 3 Manual step transformer INA 6501 The step transformer type INA 6501 is a standard accessory for the Schaff ner Modula 6100 instrumentation series It provides a convenient means for reducing the incoming supply voltage by pre set amounts It is required for power quality testing PQT and is fully compliant with the latest revisions of IEC 61000 4 11 2004 TASEO Advanced Test Solutions for EMC 124 JAY ON OFF TASEO INA 6501 STEPTRANSFORMER 16A1250V Z It is fitted with carrying handles as part of its overall good ergonomic design which makes for ease of handling Further the unit may be used in any of three operating positions laying or standing on a work bench or for more permanent applications it can be wall mounted tion as the stability is limited The cabling connecting INA 6501 to mains and Modula presents a risk of being unvoluntarly caught by the users which could cause the INA 6501 to fall down Care has to be taken in case of use in standing posi The few control elements are readily accessible on the front panel An EUT power on off switch with a power on indicator and a well proportioned rotary switch to se
28. inhib A built in circuit breaker enables the EUT power supply also to be switched off while the int ongoing test erlock function only blocks the generation of pulses or any other resp The interlock is a safety function to ensures the following E The interlock forms a bus to which all instruments in a system are connected TASEO Advanced Test Solutions for EMC 91 92 H The interlock feature can be connected to external safety devices door contacts test enclosure hoods etc m If any part of the interlock circuit is interrupted all the generator modules are inhibited from producing or switching high voltages Additionally the power supply to the EUT can be switched off too H Activation of this safety feature is reported to the master controller H The master controller is also notified when the interlock facility is reset H Once the interruption is over and the re instatement of the interlock has been acknowledged then power to the EUT is restored Activation of the interlock function is achieved without the help of micropro cessors and software This ensures that the safety feature is not affected or hindered in the event of a program crash 9 2 Trigger to scope output signal Between Pin 18 hi and Pin 2 8 15 20 low Inactive state at 24 V in the active state lt 2 4 V Note The trigger signal has generally a duration of approx 50 Us e g for surge testing In case of bursts its width shall
29. requirements of IEC 61000 4 9 The control is fully automatic driven from NSG 3040 Click on following icon PULSED MAGNETIC ST FIELD NSG 3040 EMC test system Following test screen will appear 147 Pulsed Magnetic Field test Field Volts to Strenght i Alt 1 A m A m Ratio r Impedance 20 BARY oo s mem SHOW STEPS es Phase Sg Ss Asynch Duration 10 Pul LK Os a Once the right Volts to A m ratio which is available on the INA 752 as well then in its calibration certificate is entered in its respective field the user will be able to enter the required test level directly in A m no need for him to proceed with calculations the instrument software does the job In case an INA 702 loop antenna is used the termination gt plug labelled Pulse needs to be used Technical specifications NSG 3040 CWM 3450 INA 752 INA 701 2 3 Parameter Value Volts to A m ratio 355 Magnetic field adjustment Software driven NSG 3040 settings 200 to 4400 V gt allows 60 to 1200 A m INA 752 weight 0 6 kg INA 752 dimensions 140 x 75 x 55 mm Typical exact value is given on INA 752 front panel TASEO Advanced Test Solutions for EMC 148 14 6 Coupling decoupling networks for data lines 14 6 1 Burst EFT coupling clamp NSG 3425 and safety cover INA 3825 The EFT bursts coupling clamp CDN 3425 is designed for the injection of fast transients into signal and data lines as specified in bas
30. s 10 pulse IEC 3 PH M FEEDER LINE LX LX LEVEL 4 16 2000 V 12 0 270790 L1 gt N 60s 10 pulse 2 6 2000 V 12 0 270780 L2 gt N 60s 10 pulse 3 6 2000 V 12 0 270790 L3 gt N 60 s 10 pulse 4 6 2000V 12 0 270790 LT gt L2 60s 10 pulse 5 6 2000 V 12 O 270790 L1 gt L3 60s 10 pulse 6 5 2000 V 12 0 270790 2 gt L3 60s 10 pulse TASEO Advanced Test Solutions for EMC 85 86 IEC 3 PH POWER LINE LX LX LEVEL 1 1 6 250 V 30 0 270790 L1 gt N 60 s 10 pulse 2 6 250V 30 0 270790 L2 gt N 60 s 10 pulse 3 6 250 V 30 0 270790 L3 gt N 60 s 10 pulse 4 6 250V 30 0 270790 LT gt L2 60s 10 pulse 5 6 250 V 30 0 270790 L1 gt L3 60 s 10 pulse 6 6 250 V 30 0 270790 L2 gt L3 60s 10 pulse IEC 3 PH POWER LINE LX LX LEVEL 2 1 6 500V 30 0 270790 L1 gt N 60 s 10 pulse 2 6 500V 30 0 270790 L2 gt N 60s 10 pulse 3 6 500V 30 0 270790 L3 gt N 60s 10 pulse 4 6 500 V 30 0 270790 L1 gt L2 60s 10 pulse 5 6 500 V 30 0 270790 L1 gt L3 60 s 10 pulse 6 6 500V 30 0 270790 L2 gt L3 60s 10 pulse IEC 3 PH POWER LINE LX LX LEVEL 3 1 6 1000 V 30 0 270790 L1 gt N 60 s 10 pulse 2 6 1000V 30 0 270790 L2 gt N 60 s 10 pulse 3 6 100
31. scroll through the tests by touch the UP and DOWN arrows on the right side of the screen to scroll through the tests Touch the button to the left of the test name to select it A red border is dis played around the selected test Figure 8 6 shows the Load User Test window with a test selected Touch the OKT button to load the test and return to the test parameter window NSG 3040 EMC test system Touch the Delete button to delete a saved test A window asking the user to 53 confirm or cancel this action will be displayed see figure 8 7 Touch OK to delete the file or Cancel to cancel this action Load User test FlashDisk UserTest EFT 1EC61000 4 4 2004 LEVEL2FOR DATA LINES EFT 1EC61000 4 4 2004 LEVEL1 FOR DATA LINES EFT 1EC61000 4 4 2004 LEVEL3 FOR DATA LINES EFT RAMPING TEST EFT LONGTERM TEST LEVEL2 COUPLING ON L1 PE EFT Load user test window Load User test FlashDisk UserTest EFT 1EC61000 4 4 2004 LEVEL2FOR DATA LINES EFT IEC61000 4 4 2004 LEVEL1 FOR DATA LINES EFT IEC61000 4 4 2004 LEVEL3 FOR DATA LINES EFT RAMPING TEST EFT LONGTERM TEST LEVEL2 COUPLING ON L1 PE EFT Delete test confirmation window NOTE Once a test has been deleted it cannot be restored TASEO Advanced Test Solutions for EMC 54 8 2 2 LOAD STANDARD TEST The NSG 3040 includes European generic standards from the IEC EN 61000 4 x which are conform to many standard
32. the generator as described below WARNING Before opening the generator make sure that it is turned OFF and disconnected from all power and signal cables To open the NSG 3040 the user must first remove the sides panels Each side panel has 4 snap fixtures which will separate when outward pressure is applied 1 Pull outward on the indentation in the front of the side panel A blunt tool which will not scratch the paint on the panel may be used 2 Pull outward to separate the panel from the snap fixtures 3 Remove the upper screws on both sides of the generator cover 4 Remove the NSG 3040 cover The SD card slot is located at the right front of the generator in back of the front panel 5 Press the SD card to release it Remove the card from the slot To install a new SD card proceed to step 7 6 To download new software from a PC to the SD card insert the card in the SD port of the PC and copy the software to the SD card The file name must remain SUI3000AP EXE Remove the SD card from the PC 7 Insert the SD card in the NSG 3040 Follow steps 1 4 in reverse to replace the generator cover and side panels 8 Restart the NSG 3040 The new software version will boot automatically and may be verified in the equipment detail window see section 7 7 1 NSG 3040 EMC test system Removing the NSG 3040 side panels and cover The SD card is placed on the upper right position ei NSG 3040 SD card s
33. to indicate the selected parameter being ready for change The value can be modified either with the red wheel or by using the keypad Touching the units repetitively will change from s min cycle Hs to ms 8 5 6 T Event Touching the T Event field it will come up with a red frame to indicate the selected parameter being ready for change The value can be modified either with the red wheel or using the keypad Touching the units repetitively will change from ms s cycle Y4 cycle or Hs 8 5 7 Test duration Touching the Test Duration field it will come up with a red frame to indicate the selected parameter being ready for change The value can be modified either with the red wheel or using the keypad Touching the units repetitively will change from Pulse Continuous s to min TASEO Advanced Test Solutions for EMC 75 76 8 5 8 Dips and drops characteristics Parameter Dips amp drops Uvar with optional variac Uvar step transformer Peak inrush current capability Switching times Phase phase synchronization Time rep repetition time Event time T Event Test duration Value From EUT voltage input to 0 V 0 0 to 265 V 0 to 115 16 A max 10 0 40 70 80 gt 500 A at 230 V 1 to 5 us 100 Q load Asynchronous synchronous 0 to 359 in 1 steps US 40 99 999 ms 1 99 999 Si 1 99 min 135 cycle 1 99 999 US 20 99 999 ms 1 9
34. unit of the system Since time critical information might not be transferred quick enough transmis sion time for one message frame takes about 20 ms an additional bus called the synchro bus is used instead where speed matters The master controller together with the function units in the same instrument can access this bus The controller also makes this bus available to other instruments via a connector on the rear panel TASEO Advanced Test Solutions for EMC 31 32 The interfaces for the interbus interlock and synchro bus are bundled together in a sub D connector These three interfaces are looped through from one instrument to another applied when connecting signals to this port As the whole system generates disturbances in order to avoid auto disturbing all wires connected to this port should be properly shielded the shield of the cable not serving as signal return path the shield to be connected via a large surface to the conductive shell of the Sub D plug NOTE Good EMC engineering practices should be NSG 3040 EMC test system 7 THE STANDARD USER INTERFACE 33 SUI H The NSG 3040 Standard User Interface SUI consists of A 7 color touch panel A wheel for setting parameters A wheel sensitivity keys labeled 1 10 and 100 to denote the units A Start key show symbol to start tests A Stop key show symbol to stop tests A Pause key show symbol to pause tests m
35. up to 40 A m It complies to the requirements of IEC 61000 4 8 Wi SSI M gt TSSEQ MAGNETIC FIELD GENERATOR MFO 6501 PREZ MFO 6501 can be used as a stand alone It is fitted with carrying handles as part of its overall good ergonomic design which makes for ease of handling Further the unit may be used in any of three operating positions laying or standing on a work bench or for more permanent applications it can be wall mounted tion as the stability is limited so the cabling connecting MFO 6501 to mains and Modula presents a risk of being unvoluntarly caught by the users causing the MFO 6501 to fall down Care has to be taken is case of use in standing posi The few control elements are readily accessible on the front panel A rotary knob to set the necessary current a 50 60 Hz frequency selector and a low high range selector ensure easy and intuitive operation TASEO Advanced Test Solutions for EMC 138 Two safety banana sockets provide a convenient means to connect the loop antenna two other ones shorted by a jumper to connect an external amp meter for monitoring the generated current as the field generated in the loop antenna is directly proportional to the current flowing through it Field strength A m H Cf x Where H is the generated field Cf the coil factor the current flowing through the loop The unit has been designed for use in rugged industrial environments Pro fessional q
36. 0 0 01s _ 3 pulses IEC DCV DIPS 301 5 40 0 035 3 pulses IEC DCV DIPS 100MS_ 40PC IEC DCV DIPS 300MS_ 40PC IEC DCV DIPS 1S 40PC 0 1 s 3 pulses 3 pulses IEC DCV DIPS 10MS 70PC 3 pulses IEC DCV DIPS 30MS_ 70PC 3 pulses IEC DCV DIPS 100MS 70PC 3 pulses IEC DCV DIPS 300MS_ 70PC 3 pulses IEC DCV DIPS 1S 70PC 70 10s 18 3 pulses IEC DCV INTERRUPTION 1MS OPC 0 10s 00015 3pulses IEC DCV INTERRUPTION 3MS OPC 0 10s 00035 3pulses IEC DCV INTERRUPTION 10MS 0PC 0 10s 0 01s _ 3 pulses IEC DCV INTERRUPTION 30MS OPC 0 03s 3 pulses IEC DCV INTERRUPTION 100MS_ OPC IEC DCV INTERRUPTION 300MS OPC Dis 3 pulses 0 38 3 pulses IEC DCV INTERRUPTION 1S OPC 1s 3 pulses IEC DCV VARIATION 100MS _ 85PC IEC DCV VARIATION 300MS _ 85PC IEC DCV VARIATION 1S _ 85PC Dis 3 pulses 0 3 s 3 pulses 1s 3 pulses IEC DCV VARIATION 3S 85 0 3s 3 pulses IEC DCV VARIATION 105 85PC 10s 3 pulses IEC DCV VARIATION 100MS 12000 IEC DCV VARIATION 300MS 12000 IEC DCV VARIATION 1S 120 09 3 pulses 3 pulses IEC DCV VARIATION 3S 120 0 3 pulses IEC DCV VARIATION 10S 120 09 3 pulses IEC DCV VARIATION 100MS 8090 IEC DCV VARIATION 300MS 8090 IEC DCV VARIATION 1S 80PC 3 pulses 3 pulses IEC DCV VARIATION 3S 80 09 3s 3 puls
37. 0 pulse IEC DC LINES L N 12 R LEVEL 3 1 3 500 V 12 Asynch L1 gt N 60 s 10 pulse 2 3 1000 V 12 Asynch L1 gt N 60 s 10 pulse 3 3 2000 V 12 Asynch L1 gt N 60 s 10 pulse IEC DC LINES L N 12 RLEVEL 4 1 4 500 V 12 Asynch L1 gt N 60 s 10 pulse 2 4 1000 V 12 Asynch L1 gt N 60 s 10 pulse 3 4 2000 V 12 Asynch L1 gt N 60 s 10 pulse 4 4 4000 V 12 Asynch L1 gt N 60 s 10 pulse IEC DC LINES L N 30 RLEVEL 1 11 500 V 30 Asynch L1 gt N 60 s 10 pulse IEC DC LINES L N 30 RLEVEL 1 1 2 500 V 30 Asynch L1 gt N 60 s 10 pulse 2 2 1000 V 30 Asynch L1 gt N 60s 10 pulse IEC DC LINES L N 30 R LEVEL 1 1 3 500 V 30 Asynch L1 gt N 60 s 10 pulse 2 3 1000 V 30 Asynch L1 gt N 60s 10 pulse 3 3 2000 V 30 Asynch L1 gt N 60 s 10 pulse IEC DC LINES L N 30 RLEVEL 1 1 4 500 V 30 Asynch L1 gt N 60 s 10 pulse 2 4 1000 V 30 Asynch L1 gt N 60 s 10 pulse 3 4 2000 V 30 Asynch L1 gt N 60 s 10 pulse 4 4 4000 V 30 Asynch L1 gt N 60s 10 pulse IEC UNSH UNSY MM O LINES LEVEL 1 1 1 500 V 12 Asynch Output 60s 10 pulse IEC UNSH UNSY MM O LINES LEVEL 2 1 2 500 V 12 Asynch Output 60s 10 pulse 2 2 1000 V P 12 Asynch Output 60s 10 pulse IEC UNSH UNSY MM O LINES LEVEL 3 1 3 500 V 12 Asynch Output 60s 10 pulse 2 3 1000 V 12 Asynch Output 60 s 10 pulse 3 3 2000 V 12 Asynch Output 60 s 10 pulse IEC UNSH UNSY MM O LINES LEVEL 4 1 4 500 V 12 Asynch Output 60s 10 pulse 2 4 1000 V 12 Asynch Output 60s 10 pulse 3 4 2000 V 1
38. 004 Instrument supply 85 to 265 VAC 50 60 Hz Power consumption lt 20W EUT supply input voltage 10 to 240 VAC not suited for DO EUT supply input current 16A EUT supply frequency 458 to 65 Hz EUT output voltage Uin test voltage Adjustable from 0 to 265 VAC EUT output voltage UVar dip voltage Adjsutable from 0 to 265 VAC or from O to 115 of Uin TASEO Advanced Test Solutions for EMC 115 116 Adjusting accuracy lt 2 EUT output current 16 A cont for variac set to 100 Uin 20 A for 5 s for variac set to 80 Uin 23 A for 3 s for variac set to 70 Uin 40 A for 3 s for variac set to 40 Uin Load regulation lt 5 Uin variac set to 100 Uin 010 16 A lt 5 Uin variac set to 80 Uin O to 20 A lt 5 Uin variac set to 70 Uin 0to23A lt 5 Uin variac set to 40 Uin 010 40 A Max regulation speed 140 V sec EUT Power ON OFF Local or remote manual or auto matic Dimensions W 449 mm 17 7 19 with rack mounting brackets H 328 mm 12 9 7 HU Dy Sy 222 Weight VAR 3005 D16 ca 58 kg 127 Ibs VAR 3005 S16 ca 40 kg 89 Ibs Installation connection to NSG 3040 MAINS should be switched off during installation and gt intercorrection Connect instrument power from the mains Remove 25 way Sub D plug at rear of NSG 3040 Connect this connector to X2 of VAR 3005 Connect master controller 25 way output to VAR 3005 X1 plug using system interface cable deliv
39. 040 instrumentation series It provides a convenient means of reducing the incoming supply voltage by pre set amounts It is required for power qual ity testing PQT and is fully compliant with the latest revision of IEC 61000 4 11 2004 TASEO Advanced Test Solutions for EMC 128 Its control is fully automatic driven from NSG 3040 Once detected by the NSG 3040 and declared to the functions offered by INA 6502 are available in the software Connect INA 6501 EUT power out to NSG 3040 EUT power input Connect INA 6501 EUT power in to mains using EUT power in cable delivered with NSG 3040 Connect th is connector to X2 of INA 6502 So the settings 0 40 70 80 will appear as well as the possibility to switch EUT power on off INA 6502 comes fitted with carrying handles as part of it s overall good ergo nomic design which makes for ease of handling Further the unit may be used in any of two operating positions laying on a work bench or for more perma nent applications it can be wall mounted The unit has been designed for use in rugged industrial environments Profes sional quality connectors ensure user safety additional system protection is provided by a 16 A fuse located in the top panel NSG 3040 EMC test system Thanks to the provision of an 80 voltage position and to the large over cur 129 rent capabilities the step transformer is fully compliant with the latest require ments called
40. 0V 30 0 270790 L3 gt N 60s 10 pulse 4 6 1000 V 30 0 270790 L1 gt L2 60s 10 pulse 5 6 1000 V 30 0 270790 Li gt L3 60s 10 pulse 6 6 1000 V 30 0 270790 L2 gt L3 60 s 10 pulse IEC 3 PH POWERLINE LX LX LEVEL 4 1 6 2000 V 30 0 270790 L1 gt N 60 s 10 pulse 2 6 2000 V 30 0 270790 L2 gt N 60 s 10 pulse 3 6 2000 V 30 0 270790 L3 gt N 60s 10 pulse 4 6 2000 V 30 0 270790 L1 gt L2 60s 10 pulse 5 6 2000 V 30 0 270790 LT gt L3 60s 10 pulse 6 6 2000 V 30 0 270790 L2 gt L3 60s 10 pulse IEC 3 PH M FEEDER LINE LX PE LEVEL 1 1 4 500 V 12 0 270 90 L1 gt PE 60 s 10 pulse 2 4 500 V 12 0 270 90 L2 gt PE 60 s 10 pulse 3 4 500 V 12 0 270 90 L3 gt PE 60 s 10 pulse 4 4 500 V 12 0 270 90 N gt PE 60s 10 pulse IEC 3 PH M FEEDER LINE LX PE LEVEL 2 1 4 1000 V 12 0 270 90 D gt PE 60s 10 pulse 2 4 1000 V 12 0 270 90 L2 gt PE 60s 10 pulse 3 4 1000 V P 12 0 270 90 L3 gt PE 60s 10 pulse 4 4 1000 V 12 0 270 90 N gt PE 60s 10 pulse IEC 3 PH M FEEDER LINE LX PE LEVEL 3 1 4 2000 V 12 0 270 90 L1 gt PE 60 s 10 pulse 2 4 2000 V 12 0 270 90 L2 gt PE 60s 10 pulse 3 4 2000 V 12 0 270 90 L3 gt PE 60s 10 pulse 4 4 2000 V 12 0 270 90 N gt PE 60s 10 pulse IEC 3 PH M FEEDER LINE LX PE LEVEL 4 1 4 4000 V 12 0 270 90 L1 gt PE 60s 10 pulse 2 4 4000 V 12 0 270 90 L2 gt PE 60s 10 pulse 3 4 4000 V 12 0 270 90 L3 gt PE 60s 10 pulse 4 4 4000 V
41. 1 impedance box and WIN 2120 software The system can generate supply frequency fields 50 Hz and 60 HZ up to 330 A m continuously and 1100 A m short term 3 seconds The INA 703 can also be used with the MFO 6501 or 6502 Current sources and the NSG 3000 series of generators to generate supply frequency fields 50 HZ and 60 Hz up to 120 A m continuously and 120 A m short term 3 seconds For testing to IEC 61000 4 9 the INA 703 can be used with a classic Combina tion Wave generator such as the NSG 3040 or NSG 3060 series plus an INA 752 pulse wave shape adapter For testing to IEC 61000 4 10 the INA 703 can be connected to an appropriate Slow Oscillatory Wave generator With its multi turn concept and professional mechanical design features such as the U shaped caster base for convenient positioning at the test table the INA 703 is the ideal accessory for magnetic field testing In order to meet the pulse waveform required by IEC 61000 4 9 the wave shape adapter INA 752 needs to be used with NSG 3040 and the INA 701 702 or loop antennas NSG 3040 EMC test system 14 4 1 Manual solution MFO 6501 137 The manually operated current generator type MFO 6501 magnetic field op tion is a standard accessory for the Teseq NSG 3040 series It provides a convenient means for generating and adjusting the current to flow through one of the magnetic field loops INA 701 or INA 702 It is required for mag netic field testing for fields
42. 16 A less than 5 80 Output 0 to 20 A less than 5 70 Output 0 to 23 A less than 5 40 output O to 40 A less than 5 Output current capability at 230 V input voltage 16 Arms at 100 output 20 Arms at 80 output 23 Arms at 70 output 40 Arms at 40 output Voltage selection Software driven EUT power on off function Front panel switch with on indicator software driven from NSG 3040 Fuse 16 A slow blow Connectors Harting type HAN3A Power Supply Selectable 100 110 V 220 240 V 15 VA Size 460 x 200 x 160 mm Weight 15 kg approx Output cable length 2 meter Input cable NSG 3000 standard cable to be used Control cable 2 meter 25 way sub D twisted pair shielded included in delivery Parts description Plug X3 Remote TEST and EUT power off with shorting plug Allows to con nect external door switch or equivalent Interrupts the 24 V supply of the circuit breaker contactor which switches EUT supply on off The information will be transmitted to NSG 3040 which will stop the test Plug 2 NSG 3040 system interface OUT to be terminated by interlock plug or to be linked to another accessory to X1 plug NSG 3040 EMC test system Plug NSG 3040 system interface IN to be connected to NSG 3040 or to another accessory to X2 plug Power LED green shows if instrument is powered up Error LED red ERROR LED off No problem accessory is ready to run ERROR LED blinking Problem which may be solved by user inte
43. 2 Asynch Output 60s 10 pulse 414 4000 V 12 Asynch Output 60s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 1 11 500 V 12 Asynch Output 60s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 2 1 2 500 V 12 Asynch Output 60s 10 pulse 2 2 1000 V 12 Asynch Output 60s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 3 1 3 500 V 12 Asynch Output 60s 10 pulse 2 3 1000 V 12 Asynch Output 60 s 10 pulse 3 3 2000 V 12 Asynch Output 60s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 4 1 4 500 V 12 Asynch Output 60s 10 pulse 2 4 1000 V 12 Asynch Output 60s 10 pulse 3 4 2000 V 12 Asynch Output 60s 10 pulse 4 4 4000 V 12 Asynch Output 60 s 10 pulse Test File name implemented Test step i Frequency Fs Ces Factor EC 50HZ CF 9 8 LEVEL 1 1 A m 50Hz Hz EE 1 Alm 60 Hz EE SE 3Am som os 88 R samf eom 60s EC SOE OF OBLEVELS el ae os sa IEC 60HZ CF 9 8 LEVEL 3 10 A m 60 Hz 60 s IEC 50HZ CF 9 8 LEVEL 4 30 A m 50 Hz 60s 602 63 02 5 I EE as 38 TASEO Advanced Test Solutions for EMC 88 Basic Standard IEC 61000 4 9 2001 Ed_1 1 File name implemented IEC LEVEL 3 V to A m Ratio IEC LEVEL 4 IEC LEVEL 5 NSG 3040 EMC test system Basic Standard IEC 61000 4 11 2002 Ed 2 File name implemented Phase Rep time T Event ts Test duration IEC 50HZ CLASS 2 DIPS OPC 0 5 CYCLE 0 315 45 10 ms 3 pulses IEC 60HZ CLASS 2 DIPS OPC 0 5 CYCLE 0 315 45 8333 us 3 pul
44. 70 90 N gt PE 60s 10 pulse TASEO Advanced Test Solutions for EMC 81 82 0 270 90 IEC 3PH POWER LINES LX LX LEVEL 1 1 6 500 V 0 270 90 L1 gt N 60s 10 pulse 2 6 500 V 0 270 90 L2 gt N 60s 10 pulse 3 6 500 V P 0 270 90 L3 gt N 60s 10 pulse 10 pulse 0 270 90 5 6 500 V 0 270 90 Li gt L3 60s 10 pulse 6 6 500 V 0 270 90 L2 gt L3 60s 10 pulse IEC 3PH POWER LINES LX LX LEVEL 2 1 6 1000 V 0 270 90 L1 gt N 60s 10 pulse 2 6 1000 V 0 270 90 L2 gt N 60s 10 pulse 3 6 1000 V 0 270 90 L3 gt N 60s 10 pulse 10 pulse ai pl rl pl l vin 516 1000 V 0 270790 L1 gt L3 60s 10 pulse 66 1000V 0 270790 L2 gt L3 60s 10 pulse TEC 3PH POWER LINES LX LX LEVEL 3 1 6 2000 V 0 270790 1 gt N 60 s 10 pulse 2 6 2000 V 0270780 D gt N 60s 10 pulse 36 2000V 0 270790 L3 gt N 60s 10 pulse 46 2000 V 0 270790 L1 gt L2 60s 10 pulse 5 6 2000V O 270790 1 gt L3 60s 70 pulse 66 2000 V 0 270790 _ L2 g
45. 9 999 E 1 11999 cycle 1 99 999 140 cycle 1 3000 Si 1 99 999 min 1 70 000 event 1 99 999 Continuous 8 6 Variation test 4 11 automatic procedure Parameter Uvar with optional variac Phase synchronization Repetition time NSG 3040 EMC test system Value 0 to 265 V in 1 V steps 0 to 115 in 1 steps asynchronous synchronous 0 to 359 in 1 steps 1000 ms to 35 min 1 to 99 999 cycles Decreasing time Td Abrupt Time at reduced voltage Ts 10 ms to 10s Increasing time Ti 10msto5s Test duration 1 sto 99 999 min Automatic a 1msto5s 1 to 250 cycles for 50 H 1 to 300 cycles for 60 Hz N 1 to 250 cycles for 50 H 1 to 300 cycles for 60 Hz N 1 to 250 cycles for 50 Hz 1 to 300 cycles for 60 Hz 1 to 99 999 pulse Continous ccessories for power quality test All automated standard accessories for PQT test provide a convenient means of reducing th e incoming supply voltage Once detected the functions are available in the user interface software Its fully automatic controlled driven from NSG 3040 with the step will appear Connecting th will be possib transformer INA 6502 the Uvar settings 0 40 70 80 e single variac VAR 6501 or VAR 3005 S16 the settings of Uvar e in volts or of Uin Therefore Uin needs to be set first in the General settings menu Uin in this case is the actual input voltage of the single varia
46. CDN or to make an injection probe to couple surge pulses to shielded data lines and EUT s housings SHV plug burst out for all Schaffner Teseq Burst generators Burst CDNs and coupling clamps For cable diam eter 5 1 mm typical RG 58 or INA 6547 or INA 6548 20 kV coax cable length 1 m To be used together with INA 6545 for con nection to external CDN or to make an injection probe to couple surge pulses to shielded datalines and EUT s hous ings 20 kV coax cable length 5 m To be used together with INA 6545 for con nection to external CDN or to make an injection probe to couple surge pulses to shielded datalines and EUT s hous ings DC supply adapter Consists of EUT Power IN cable fitted with safety ba nana plugs at the other end For NSG 3000 series 14 9 INA 3000 Trolley INA 3000 14 10 Rack mounting brackets INA 166 Trolley for NSG 3000 series Conve nient accessory to get standalone in struments stacked and mobile through large castors Static load lt 150 kg Rack mounting brackets 4 HU for NSG 3040 series TASEO Advanced Test Solutions for EMC 163 4 15 SYSTEM DESCRIPTION EM Description Housing Mains on off Indicator LED s on front panel Safety functions Ambient conditions Self test Relevant safety standards Test system for EMC tests with mains borne inter ference in accordance with the EN 61000 6 1 and 2 standards for burst surge and mains qualit
47. G package or can be down loaded from the Teseq web site Insert the CD and double click on setup exe and follow the instructions on the screen The required communication cable Crossover S FTP cable is also part of the delivery All required documentation is also available on the CD under pdf file format Consult first the document Software Version History Vx yz to verify which FW and SUI version you may need to install for a proper function of the gen erator WIN 3000 requires always the corresponding FW and SUI software The proper FW and SUI software are on the WIN 3000 installation disk or can be downloaded from the Teseq website WIN 3000 features a free 30 days licence of the professional version WIN 3000 SRD NSG 3040 EMC test system WIN 3000 SDR the extension SDR is for sequences Dialogs Re 109 ports WIN 3000 SDR is the professional version of PC Software for NSG 3xxx series It features the basic settings possibilities of WIN 3000 inclusive parameter ramping stepping etc and includes additionally Test library covering most of basic and generic standards Test sequencer Real time report facility in MS Word Dialogs facility with the user WIN 3000 and NSG 3000 series can run via a LAN One software licence is always valid for one NSG 3xxx instrument but unlim ited in amount of computers Once purchased the delivered licence can be installed to an unlimited amount of compu
48. H POWER LINES L PE LEVEL 3 0 270 90 10 pulse 0 270 90 10 pulse 0 270 90 10 pulse 0 270 90 10 pulse 0 270 90 10 pulse 0 270 90 10 pulse 0 270 90 10 pulse IEC 1PH POWER LINES N PE LEVEL 1 0 270 90 10 pulse IEC 1PH POWER LINES N PE LEVEL 2 0 270 90 10 pulse 0 270 90 10 pulse IEC 1PH POWER LINES N PE LEVEL 3 12 0 270 90 10 pulse 12 0 270 90 10 pulse 12 0 270 90 10 pulse IEC 1PH POWER LINES N PE LEVEL 4 12 0 270 90 10 pulse 12 0 270 90 10 pulse 12 0 270 90 10 pulse 12 0 270 90 10 pulse NSG 3040 EMC test system Basic Standard IEC 61000 4 5 File name implemented Test step Voltage Polarity Impedance Phase Coupling Rep time Test duration IEC 1PH POWER LINES L NLEVEL 1 11 500 V 2 0 2707 90 L gt N 60 s 10 pulse IEC 1PH POWER LINES L N LEVEL 2 1 2 500 V 2 0 270 90 L gt N 60 s 10 pulse 2 2 1000 V 2 0 2707 90 L gt N 60 s 10 pulse IEC 1PH POWER LINES L N LEVEL 3 1 3 500 V 2 0 2707 90 L gt N 60 s 10 pulse 2 3 1000 V 2 0 2707 90 L gt N 60 s 10 pulse 3 3 2000 V 2 0 270 90 L gt N 60 s 10 pulse IEC 1PH POWER LINES L N LEVEL 4 1 4 500 V 2 0 270 90 L
49. OMM LINES LEVEL 3 1 3 500 V 15 Asynch Surge Output 60s 10 pulse 23 1000 V 15 Asynch Surge Output 60s 10 pulse 38 2000 V 15 Asynch Surge Output 60s 10 pulse SHIELDED IO COMM LINES LEVEL 4 1 4 500 V 15 Asynch Surge Output 60s 10 pulse 2 4 1000 V 15 Asynch Surge Output 60s 10 pulse 3 4 2000V 15 Asynch Surge Output 60 s 10 pulse 474 4000 V s 15 Asynch Surge Output 60s 10 pulse TASEO Advanced Test Solutions for EMC Basic Standard IEC 61000 4 12 2006 Ed 2 File name implemented Test step Voltage Polarity impedance Phase Coupling __ Rep time Test duration IEC 1 PH M FEEDER LINEL NLEVEL 1 11 250 V 12 o 270790 L gt N 60s 10 pulse IEC 1 PH M FEEDER LINEL NLEVEL 2 1 2 250 V 12 0 2707 80 L gt N 60s 10 pulse 2 2 500 V 12 o 270780 L gt N 60s 10 pulse IEC 1 PH M FEEDER LINEL NLEVEL 3 1 8 250 V 12 o 270790 _L gt N 60s 10 pulse 23 500 V z 12 0 270790 L gt N 60s 10 pulse 3 3 1000 V 12 _ 0 270790 _ L gt N 60s 10 pulse IEC 1 PH M FEEDER LINEL NLEVEL 4 1 4 250 V 12 o 270790 L gt N 60s 10 pulse 2 4 500 V R 12 _ o 270790 _L gt N 60s 10 pulse 3 4 1000 V 12 o 2707 80 L gt N 60s 10 pulse 474 2000 V 12 o 270700 L gt N 60s 10 pulse IEC 1 PH POWER LINEL N LEVEL 1 Vu 250 V 30 0 2707 0 L gt N 605 10 pulse IEC 1 PH POWE
50. PE 750us 300ms 1205 ANSFIEC 1PH POWERLINES LEVEL 4 1 2 4000 V 5 kHz Asynch L N PE 15 ms 300 ms 1205 22 4000 V 100kHz Asynch L N PE 750us 300ms 120s ANSFIEC 3PH POWERLINES LEVEL 1 1 2 500V 5 kHz Asynch L1 L2 L3 N PE 15 ms 300ms 120s 2 2 500V 100kHz _ Asynch L1 L2 L3 N PE 750us 300ms 1205 ANSFIEC 3PH POWER LINES LEVEL 2 1 2 1000V 5 kHz Asynch L1 L2 L3 N PE 15 ms 300ms 1205 22 1000 V 100 kHz Asynch L1 L2 L3 N PE 750us 300 ms 1205 ANSHIEC 3PH POWER LINES LEVEL 3 1 2 2000V 5 kHz Asynch L1 L2 L3 N PE 15 ms 300ms 120s TASEO Advanced Test Solutions for EMC 2 2 2000 V 100 kHz Asynch L1 L2 L3 N PE 750us 300 ms 120 s ANSI IEC 3PH POWER LINES LEVEL 4 1 2 4000 V 5 kHz Asynch L1 L2 L3 N PE 15 ms 300 ms 120s 2 2 4000 V 100 kHz Asynch L1 L2 L3 N PE 750us 300 ms 120 s ANSI IEC CAP COUPL LEVEL 1 1 2 250 V 5 kHz Asynch Burst output 15 ms 300 ms 120s 2 2 250 V 100 kHz Asynch Burst output 750us 300 ms 120s ANSFIEC CAP COUPL LEVEL 2 1 2 500 V 5 kHz Asynch Burst output 15 ms 300 ms 120s 2 2 500 V 100 kHz Asynch Burst output 750us 300 ms 120s ANSFIEC CAP COUPL LEVEL 3 1 2 1000V 5 kHz Asynch Burst output 15 ms 300 ms 120s 2 2 1000V 100 kHz Asynch Burst output 750us 300 ms 120s ANSHIEC CAP COUPL LEVEL
51. R LINE L PE LEVEL 2 1 2 500 V 0 0 270790 L gt PE 60 s 10 pulse 2 2 1000 V 300 0 270780 L gt PE 60s 10 pulse IEC 1 PH POWER LINE L PE LEVEL 3 13 500V 0 0 270790 L gt PE 60s 10 pulse 2 3 1000 V 300 0 270780 L gt PE 60s 10 pulse 33 2000V 20 ohm 0 270790 L gt PE 60s 10 pulse IEC 1 PH POWER LINE L PE LEVEL 4 1 4 500 V P 300 0 270780 L gt PE 60s 10 pulse 2 4 1000 V 00 0 270 90 L gt PE 60s 10 pulse 3 4 2000 V 300hm 0 270 90 L gt PE 60 s 10 pulse D 4000 V 30 ohm 0 270 90 L gt PE 60s 10 pulse IEC 1 PH M FEEDER LINE N PE LEVEL 1 11 500 V 12 0 270790 N gt PE 60s 10 pulse IEC 1 PH M FEEDER LINE NPE LEVEL 2 1 2 500 V 12 0 270790 N gt PE 60s 10 pulse 2 2 1000V 12 0 270780 N gt PE 60s 10 pulse IEC 1 PH M FEEDER LINEN PE LEVEL 3 1 3 500 V 12 0 270790 _N gt PE 60s 10 pulse 2 3 1000 V P 12 0 270790 N gt PE 60s 10 pulse 373 2000 V 12 0 270790 N gt PE 60s 10 pulse TEC 1 PH M FEEDER LINEN PE LEVEL 4 14 500V k 12 0 270790 N gt PE 60s 10 pulse 2 4 1000 V 12 0 270790 N gt PE 60s 10 pulse 3 4 2000 V P 12 0 270780 N gt PE 60s 10 pulse 20 4000 V 12 0 270790 N gt PE 60s 10 pulse IEC 1 PH POWER LINE N PE LEVEL 1 11 500 V 30 ohm 0 270 90 N gt PE 60 s 10 pulse IEC 1 PH POWER LINE N PE LEVEL 2 1 2 500 V 30 ohm 0 270 90 N gt PE 60 s 10 pulse 2 2 1000 V 30 ohm 0 270790 N gt PE 60s 10 pulse IEC 1 PH
52. R LINEL N LEVEL 2 1 2 250 V 30 o 270790 L gt N 60s 10 pulse 2 2 500 V 30 0 2700 L gt N 60s 10 pulse IEC 1 PH POWER LINEL N LEVEL 3 1 3 250 V 30 _ 0 270790 L gt N 60s 10 pulse 213 500 V 30 0 2707 0 L gt N 605 10 pulse 33 1000 V F 30 o 270790 L gt N 60s 10 pulse TEC 1 PH POWER LINEL NLEVEL 4 174 250V 30 0 200 L gt N 605 10 pulse 2 4 500 V 30 _ 0 270790 L gt N 60s 10 pulse 3 4 1000 V 30 0 2707 0 L gt N 605 10 pulse 414 2000 V 30 o 270790 L gt N 60s 10 pulse IEC 1 PH M FEEDER LINE L PE LEVEL 1 11 500V 12 0 270780 L gt PE 60s 10 pulse IEC 1 FH M FEEDER LINE L PE LEVEL 2 1 2 500 V 18 0 270790 L gt PE 605 10 pulse 2 2 1000 V 12 _ 0 270790 L gt PE 60s 10 pulse TEC 1 PH M FEEDER LINE L PELEVEL 3 173 500 V 12 O 270790 L gt PE 605 10 pulse 2 3 1000 V F 12 o 270780 L gt PE 60s 10 pulse 373 2000 V F 12 O 270790 L gt PE 605 10 pulse IEC 1 PH M FEEDER LINE L PE LEVEL 4 14 500V 12 0 270790 L gt PE 60s 10 pulse 2 4 1000 V 12 0 2707 0 L gt PE 605 10 pulse 3 4 2000 V 12 o 27070 L gt PE 60s 10 pulse 474 4000 V 128 0 270790 L gt PE 605 10 pulse NSG 3040 EMC test system IEC 1 PH POWER LINE L PE LEVEL 1 1 1 500 V 300 0 270790 L gt PE 60s 10 pulse IEC 1 PH POWE
53. SG 3040 EMC test system The Teseq high voltage differential probe MD 200 serie is ideally suited 155 to measure all kinds of EMI pulses in the microsecond range industrial telecom and automotive surges as well as power line dips dropouts and distortions MD 200 MD 200A Technical specifications MD 200 Attenuation ratio 2 ranges 1 100 and 1 1000 Bandwith DC to 10 MHz Accuracy 2 Max input voltage different mode 7000 V peak Max input voltage common mode 3500 V peak Input impedance 10 MQ 7 pF each side ground CMRR typical 80 dB at 50 Hz 60 dB at 20 kHz Operating temperature 10 to 40C 14 to 104 F Dimensions LXWXH 207 x 83 x 38 MM 8 1 x 0 32 x 0 15 Connector to scope BNC and auxiliary earth lead Input connectors HV alligator clip Weight 500 g approx 1 1 Ibs Technical specifications MD 200A Attenuation ratio 2 ranges 1 100 and 1 1000 Bandwith DC to 10 MHz Accuracy 2 Max input voltage different mode 7000 V peak Max input voltage common mode 7000 V peak Input impedance 10 MQ 7 pF each side ground TASEO Advanced Test Solutions for EMC 156 Input impedance 10 MQ 7 pF each side ground CMRR typical 80 dB at 50 Hz 60 dB at 20 kHz Operating temperature 10 to 40 C 14 to 104 F Dimensions LXWXH 207 x 83 X 38 mm 8 1 x 0 32 x 0 15 Connector to scope BNC and auxiliary earth lead Input connectors HV alligator clip Weight 500 g approx 1 1 I
54. UNSH SYMM COMM LINES LEVEL 3 1 3 500 V 2 Asynch Surge Output 60s 10 pulse ER 1000 V 2 Asynch Surge Output 60 s 10 pulse 38 2000 V 2 Asynch Surge Output 60 s 10 pulse IEC UNSH SYMM COMM LINES LEVEL 4 1 4 500 V 2 Asynch Surge Output 60s 10 pulse 2 4 1000 V 2 Asynch Surge Output 60s 10 pulse 3 4 2000 V 2 Asynch Surge Output 60s 10 pulse 4 4 4000 V 2 Asynch Surge Output 60 s 10 pulse Basic Standard IEC 61000 4 5 2005_Ed_2 File name implemented Test step Voltage Polarity Impedance Dees Coupling Rep time Test duration SYMM OPERATED ALL LINES TO PE LEVEL 1 11 500V 15 Asynch Surge Output 60s 10 pulse SYMM OPERATED ALL LINES TO PE LEVEL 2 1 2 500 V 15 Asynch Surge Output 60s 10 pulse ES 1000 V 15 Asynch Surge Output 60s 10 pulse SYMM OPERATED ALL LINES TO PE LEVEL 3 1 3 500 V 15 Asynch Surge Output 60s 10 pulse 23 1000 V 15 Asynch Surge Output 60s 10 pulse 38 2000V 15 Asynch Surge Output 60s 10 pulse SYMM OPERATED ALL LINES TO PE LEVEL 4 1 4 500 V 15 Asynch Surge Output 60s 10 pulse 274 1000V m 15 Asynch Surge Output 60s 10 pulse 3 4 2000V 15 Asynch Surge Output 60s 10 pulse 44 4000 V 15 Asynch Surge Output 60s 10 pulse SHIELDED IO COMM LINES LEVEL 1 1 1 500 V 15 Asynch Surge Output 60s 10 pulse SHIELDED IO COMM LINES LEVEL 2 1 2 500 V 15 Asynch Surge Output 60s 10 pulse ES 1000 V 15 Asynch Surge Output 60 s 10 pulse SHIELDED IO C
55. al field within the coil parameters The magnetic field coils available as accessories are connected to the surge pulse output socket via an INA 752 pulse shaping network NSG 3040 EMC test system 4 SAFETY INSTRUCTIONS H The NSG 3040 system and its accessories operate at high voltages E WARNING Improper or careless operation can be fatal These operating instructions form an essential part of the equipment and must be available to the operator at all times The user must obey all safety instruc tions and warnings Neither Teseq AG Luterbach Switzerland nor any of its subsidiary sales orga nizations can accept any liability for personal material or consequential injury loss or damage that may result from improper use of equipment and acces sories 4 1 General The NSG 3040 must be operated only by authorized and trained specialists The generator is to be used only for the purpose specified by the manufacturer The user is directly responsible for ensuring that the test setup does not cause excessive radiated interference which could affect other instrumentation The test system itself does not produce any excessive EM radiation However the injection of interference pulses into a EUT can result in it and or its associated cables radiating electromagnetic radiation To avoid unwanted radiation the standards organizations recommend that the test setup be operated inside a Faraday cage TASEO Advanced Test Soluti
56. alue may be entered using the wheel or the keypad The value is in degree units and may range from 0 to 359 8 3 7 Coupling Touch the Coupling mode button IEC COUPLING in the example to select BURST OUTPUT MANUAL CDN ANSI COUPLING or IEC COUPLING Burst output Burst output must be selected if an external capacitive coupling clamp e g CDN 3425 is connected to the NSG 3040 Manual CDN The factory setting for manual CDN is the same as for burst output IEC coupling Touch the coupling line selection field L1 N PE in the example to display the coupling selection window Touch the individual high output coupling line buttons L N and PE in the example to select an open or closed relay The Low output field Ref ground in the example is always fixed Touch OK to enable the coupling selection and close the window Touch Cancel to close the window without saving the coupling selection Touch Show Graphics to display a graphical example of the coupling selec tion TASEO Advanced Test Solutions for EMC 61 62 ue Ted OT et Lon Ig FE ml cancel Coupling selection window Note Burst coupling is always to HF reference ground 8 3 8 Burst time Touch the burst time button 15 in the example to set the burst time A red frame is displayed around the field The burst time may be entered using the wheel or the keypad Touch the units button ms in the exampl
57. boot period and when errors occur 6 1 6 Touch screen and user interface The color 7 touch screen display controls include a wheel and 3 sensitivity keys used to 1 10 or 100 steps per wheel click The Start Stop and Pause keys are used to control the procedure All user interface function menus and sub menus are described in standard user interface NSG 3040 EMC test system 6 2 Rear panel 27 H Ethernet connection System interface nstrument supply H EUT power input 6 2 1 Instrument supply This input is to power the instrument NOTE Do not confuse the Mains power input with the EUT power input This input contains the fuses and the instrument ON OFF switch that the voltage shown on the mains input module cor responds with the voltage of the local supply to which the instrument will be connected and that the fuses are correctly rated 2 x 3 15 AT HD WARNING Before operating the NSG 3040 make sure TASEO Advanced Test Solutions for EMC 28 6 2 2 EUT power input This input is the connection point for the power source which supplies power to the EUT The 4 pin connector is a special 16 A type A mating plug with 2 m of cable for supplying the EUT from a normal mains outlet is included with the system The connector is comprised of the pole contact La No 1 the variable voltage pole contact Lb No 3 the neutral return contact N No 2 and the ground connection to the EUT
58. bs 14 7 2 MD 300 surge pulse current probe set The MD 300 probe has been specially designed to verify surge current pulses as specified in IEC EN 61000 4 5 ANSI C62 41 and their derivates The main advantage of the MD 300 current probe is that the measuring sys tem is physical y isolated from the circuit under test The MD 300 current probe is ready to use as coming along with pre mounted coaxial cable The BNC end plug needs to be connected to the high imped ance input or 5 0 Q input of an ordinary memory oscilloscope Then the con ductor carrying the surge current to be measured is passed through the hole in the current probe The resulting voltage wave shape on the oscilloscope will then be an authentically reproduction of the actual current wave shape within the given accuracy NSG 3040 EMC test system The probe can be used for current pulse verification on surge generators 157 Optional FISCHER or LEMO connectors are available for matching the safety banana connectors of the shorting cable to the HV output of the generator For monitoring the EUT current during a test an additional IEC adaptor with the safety banana connectors can be connected to the generator EUT output for observation of one lead at a time Technical specifications Max peak current Max RMS current Nominal ratio Sensitivity Hole diameter Probe connector Scope coax cable Operating temperature Output i
59. c When using the double variac VAR 6502 or VAR 3005 D16 it is important that Uin in the General setting gets set first before entering the variation screen The value of U in is variable with the double variac TASEO Advanced Test Solutions for EMC 77 78 mechanisms it is strongly recommended to power on For proper operation of the plug and play detection first the accessory and then the NSG 3040 main frame Powering on the NSG 3040 main frame before the acces sories may result in non detection of accessories More information about variable voltage sources is available in section 13 8 7 Power magnetic field testing 4 8 automatic procedure See section 13 accessories 8 8 Pulsed magnetic field testing 4 9 See section 13 accessories NSG 3040 EMC test system 8 9 Standard test parameter Basic Standard IEC 61000 4 4 2004_Ed_2 File name implemented Test step Voltage Polarity Frequency Phase Coupling Burst time Rep time Test duration ANSHEC 1PH POWER LINES LEVEL 1 1 2 500V 5 kHz Asynch L N PE 15 ms 300ms 120s 2 2 500V 100kHz _ Asynch L N PE 750us 300ms 120s ANSFIEC 1PH POWER LINES LEVEL 2 1 2 1000V 5 kHz Asynch L N PE 15 ms 300ms 120s 2 2 1000V 100kHz _ Asynch L N PE 750us 300ms 120s ANSFIEC 1PH POWER LINES LEVEL 3 1 2 2000V 5 kHz Asynch L N PE 15 ms 300ms 120s 2 2 2000V 100kHz _ Asynch L N
60. ce effect caused during an EMC test Such events are time date stamped by the system and are stored together with the current test parameters for subsequent Use in a test report if required 9 6 EUT power off Between pin 4 hi and pin 2 8 15 20 low nput open Inactive EUT power is controolled via front panel or WIN 3000 software nputshorted Active in case EUT power is switched on shorting this input will set EUT power to off Notes 1 Using this function only makes sense if an EUT power contactor is availbale somewhere in the system EUT power contactors are available in VAR 3005 NA 6502 CDN 3061 CDN 3043 CDN 3063 TASEO Advanced Test Solutions for EMC 93 94 2 First the EUT power has to be switched ON via front panel or WIN 3000 software This way allows dual drive as the EUT power can then be switched OFF either from software control or from this external drive 3 This signal is also used to drive the orange lamp of INA 3001 warning lamps 9 7 High voltage active Between pin 16 Hi and pin 2 8 15 20 low This function is activated for firmware revisions 2 30 and higher This output is to drive external warning lamps INA 3001 The HV on signal is working together with the high voltage LED located on the front panel Output high 24 V High voltage is ON Output low 0 V High voltage is OFF NSG 3040 EMC test system 10 COUPLING NETWORK CDN 3041 95 H Parameter Instrument supply Decoupl
61. change according to the length of the event During PQT testing supply voltage variations the width of the trigger signal shall change according to the duration of the voltage dip or dropout 9 3 Synchronization Sync signal Output signal Between pin 7 hi and pin 2 8 15 20 low Inactive state at 24 V in the active state lt 2 4 V The sync signal consists of a level that goes low for each cycle of the mains frequency The reference is the signal at the power supply input EUT supply IN The position timewise of the sync signal corresponds to the specified phase angle converted into time irrespective of the supply frequency gt The sync signal is only active while an AC test is in prog ress and Fsync is set to sync NSG 3040 EMC test system 9 4 Pulse enable next step input Between pin 17 hi and pin 2 8 15 20 low Input open inactive input shorted active If this input is activated during a test run the test is halted exactly the same as the pause function in the control software The test will continue to run as soon as the input is made inactive again If the input is already active before a test is implemented then the test cannot start 9 5 EUT fail input Between pin 6 hi and pin 2 8 15 20 low Input open inactive input shorted active This connection serves as a control input that can be activated externally The EUT can activate this input if it is capable of reporting a disturban
62. chanical parameters CDN 3425 Parameter Value Length 1100 mm Width 200 mm Height 110 mm Weight 7 5 kg approx TASEO Advanced Test Solutions for EMC 150 Mechanical parameters INA 3825 Parameter Value Length 1230 mm Width 250 mm Height 170 mm Weight 3 5 kg approx Electrical parameters of the clamp Max permissible burst voltage 8 kV Parameter Value Usable length of the clamp 1100 mm Diameter of the test cable 4 to 40 mm Connectors SHV NIM female 50 Q ON both ends Distance of the earth reference plane 100 mm When used together with a burst EFT generator for more than 4 kV it is rec ommended to cover the CDN 3425 with the INA 3825 cover with interlock and to connect the foreseen interlock cable of INA 3825 to the interlock input of the EFT burst generator This way the user is protected from touching the CDN 3425 coupling plate when EFT burst pulses are applied CDN 3425 with INA 3825 protection cover NSG 3040 EMC test system 14 6 2 Surge CDN for unsymmetric datalines CDN 117 151 Teseq s CDN 117 coupling decoupling network enables convenient test ing with surge pulses of 1 2 50 us on data signal or peripheral lines as speci fied in many product standards The test method severity levels permissible reaction of the EUT and specification of the coupling networks are included in IEC EN 61000 4 5 All coupling methods described in IEC EN 61000 4 5 for unshielded un symmetrical line pa
63. connector from the generator itself since the burst con nector provides the reference ground from the generator to the CDN The NSG 3040 can be efficiently connected to the GRP using the ground strap supplied with the system This ground link must be used for burst tests to obtain reproducible test results TASEO Advanced Test Solutions for EMC 26 6 1 3 Surge output These sockets high low connect the surge output signal to an external CDN or to another external coupling unit These coaxial sockets are also used to connect the internal generator to the optional magnetic field coil for tests with pulsed magnetic fields The surge output is potential free floating The inner conductor of each con nector is the surge high and surge low connection respectively while the outer conductor screen is connected to the NSG 3040 s ground terminal 6 1 4 Burst output This socket connects the instrument to an external burst coupling clamp for capacitive coupled burst tests on data lines or to an external coupling network 6 1 5 Indicator LEDs LED indicator Function Power On Instrument system in operation Pulse Shows the occurrence of a pulses or a test event High voltage active Shows that high voltage is present in the instrument EUT Power On Indicates when the EUT power supply is present at the EUT connector on the front panel Error Indicates that a system error has occurred The LEDs switch on and off during the
64. cted before any work can be carried out on the EUT This can be achieved simply by opening the interlock circuit The EUT is to be tested only in a protective cage or under a hood which provides protection against electric shock and all manner of other dangers pertaining to the particular EUT see User warnings Generator The user must observe safety instruction for all the instruments and associated equipment involved in the test setup NSG 3040 EMC test system Test setup configuration is to be strictly in compliance with the methods described in the relevant standard to ensure that the test is executed in a compliant manner 4 6 User warnings Generator WARNING Users must be aware of the following dangers that can occur during testing Local burning arcing ignition of explosive gases EUT supply current surge caused by a flashover or breakdown resulting from the superimposed high voltage Disturbance of other unrelated electronics tele communications navigational systems and heart pacemakers through unnoticed radiation of high frequency energy In the test system the interference voltage corresponding to the level called for in the relevant test specification is superimposed also on the EUT s protective earth conductor Earth contacts or pins e g as in German and French mains plugs as well as the EUT earth itself can therefore be at an elevated voltage level that would make touching dangerous In many p
65. d Test Solutions for EMC 23 24 6 MAINFRAME DESCRIPTION O Emmi The NSG 3040 housing is specially designed for EMC applications and is EMC approved 6 1 Front panel 1 Color touch screen M LEDs wheel sensitivity keys Surge output Start stop pause keys High frequency ground point 6 1 1 EUT output This is the power output connection for the EUT An EUT mains power connector is included with the system The connector contains a phase pin L Live Neutral pin N and a ground pin for connection of the EUT The pins in the connector must be correctly wired to the corre sponding conductors in the EUT power cable If the test system is connected to a DC power source as supply for the EUT the user must ensure that the polarity at this connector corresponds with that at the EUT power connector NSG 3040 EMC test system 25 EUT output connection Note For DC power supply L positive N negative The pins in the connector are designed for a maximum current of 16 A WARNING Never attempt to connect or disconnect an EUT while a test is being performed 6 1 2 High frequency ground terminal This terminal provides a solid high frequency ground connection point to the test system If an external CDN is connected then the ground strap must be connected from the CDN to the reference ground plane There is no need to connect the ground
66. dards The system is designed to fulfill conducted electromagnetic compatibility EMC test requirements for compliance testing of household office light industrial or commercial equipment including combination wave surge Electrical Fast Transient EFT pulses and Power Quality Testing PQT The NSG 3040 s modular architecture and industry standard interfaces allow it to be easily expanded and customized to meet individual testing needs The system is designed as a series of interoperable function units with a master controller that handles the real time functions and communicates with the function modules Each function unit contains a slave controller all function units are connected together through their slave controllers and networked with the central master controller via a field bus Interbus Information concern ing special features and their adjustable parameters are stored directly in the function modules This modularity enables the function units to be combined into customized test systems and later reconfigured to address changing testing requirements The function units can be readily modified to address the requirements of news tandards and new function units for new parameters may be incorporated in existing systems The NSG 3040 is controlled through its standard user interface via a touch panel display The system can also be controlled by a remote PC via its Ethernet interface NSG 3040 EMC test system To en
67. derivates and product standards Depending on selected pulse the appropriate IEC standard test can be selected A complete list can be found in section Standard test parameter Following standard tests are in the SUI Burst IEC 61000 4 4 2009 Ed2 1 Phase power lines level 1 up to level 4 3 Phase power lines level 1 up to level 4 Capacitive coupling clamp lines level 1 up to level 4 Combination wave IEC 61000 4 5 2005 Ed 3 1 Phase power lines L N coupling level 1 up to level 4 1 Phase power lines L PE coupling level 1 up to level 4 1 Phase power lines N PE coupling level 1 up to level 4 3 Phase power lines Lx Lx coupling level 1 up to level 4 3 Phase power lines Lx PE coupling level 1 up to level 4 DC Line L N coupling level 1 up to level 4 Unshielded unsymmetrical I O lines level 1 up to level 4 Unshielded symmetrical communication lines level 1 up to level 4 NSG 3040 EMC test system Power magnetic field IEC 61000 4 8 2001 Ed 17 55 50 HZ CF 9 8 level 1 up to level 4 60 HZ CF 9 8 level 1 up to level 4 Pulsed magnetic field IEC 61000 4 9 2001 Ed 1 1 CF 0 98 level 3 up to level 5 Dip and Drop for AC power lines IEC 61000 4 11 2002 Ed 2 50 Hz AC Power Lines Class 2 Dips 0 0 5 Cycle dips up to 25 Cycle 6 Hz AC Power Lines Class 2 Dips 0 0 5 Cycle dips up to 30 Cycle 50 Hz AC Power Lines Class 3 Dips 0 0 5 Cycle dips up to 250 Cycle 60 Hz AC Power Lines Class 3 Dips 0 0 5 Cycl
68. e T Event Test duration Dips and drops characteristics Variation test 4 11 automatic procedure Power magnetic field testing 4 8 automatic procedure Pulsed magnetic field testing 4 9 Standard test parameter Description of the 25 pin D Sub signals 59 60 60 60 60 61 62 62 62 63 63 68 68 68 70 70 70 71 72 72 72 73 74 74 75 75 75 75 75 76 76 78 79 91 TASEO Advanced Test Solutions for EMC 2 1 9 2 9 3 9 4 9 5 9 6 9 7 10 11 11 11 2 11 2 1 11 2 2 1123 11 2 4 11 25 11 3 11 4 11 5 12 12 1 12 2 12 3 12 4 12 5 13 14 14 1 14 2 14 2 1 14 2 2 14 2 3 14 3 14 3 1 Interlock Trigger to scope output signal Synchronization Sync signal Output signal Pulse enable next step input EUT fail input EUT power off High voltage active Coupling network CDN 3041 Various NSG 3040 versions NSG 3040 IEC NSG 3040 a la carte ainframe NSG 3040 MF ainframe for exclusive remote control NSG 3040 MF ERC Combined wave surge module CWM 3450 Dips and drops module PQM 3403 Electrical fast transient burst module FTM 3425 NSG 3040 xxx ERC series NSG 3040 xxx EPO series NSG 3040 DDV Maintenance and function check General Cleaning Function check Calibration Warranty Declaration of conformity CE Accessories PC software Coupling decoupling networks for multiple phases higher currents and voltages CDN 3043 16 A and 32 A series CDN 3063 series 63 A and
69. e to set the time unit Time units are s ms US and spikes 8 3 9 Repetition time Touch the Repetition time button 300 in the example to set the test repeti tion time A red frame is displayed around the field The repetition time may be entered using the wheel or the keypad Touch the units button ms in the example to set the time unit Time units are s and ms 8 3 10 Test duration Touch the Test Duration button 120 in the example to set the test dura tion time A red frame is displayed around the field The duration time may be entered using the wheel or the keypad Touch the units button s in the example to set the time unit Time units are s min h and cont continuous NSG 3040 EMC test system 8 3 11 Burst generator technical data 63 Parameter Value Pulse amplitude 200 V to 4 8 kV in 1 V steps open circuit 100 V to 2 4 kV 50 Q matching system Voltage step 1V 10V 100V Polarity Positive negative alternate Frequency Hz 100 99 999 Maz on TOO Phase Asynchronous synchronous 0 to 359 in 1 steps Coupling ANSI IEC external manual Burst time Us 96 ms 1 99 999 S 1 1999 Spike 1 1000 Repetition time ms 1 99999 S 1 4 200 70 min Test duration Si 1 99 999 min 1 99 999 ME 1 1000 Continuous 8 3 12 Derating Some parameter combinations will not be accepted due to the power limitation of the HV powe
70. e The DC current capability derating is given by the specification of the Circuit breaker used to switch EUT power ON and OFF In case this internal EUT power ON OFF function is not used the DC current full ran for up to 350 VDC Name Max Current A EFT Coupling Combined wave surge coupling ge can be used Ring wave surge coupling CDN 3043 B16 16 CDN 3043 S16 16 CDN 3043 C16 16 CDN 3043 B32 32 CDN 3043 S32 32 CDN 3043 C32 32 14 2 2 CDN 3063 series 63 A and 100 A series Technical specifications Voltage ratings 480 VAC phase s to phase s 125 VDC full current range 225 VDC for max 7 A 280 VAC phase to neutral or phase to ground Note The DC current capability derating is given by the specification of the Circuit breaker used to switch EUT power ON and OFF In case this internal EUT power ON OFF function is not used the DC current full range can be used for up to 350 VDC TASEO Advanced Test Solutions for EMC 111 112 Name Max Current EFT Coupling Combined wave Ring wave A surge coupling surge coupling CDN 3063 S63 63 x X CDN 3063 5100 100 x X 14 2 3 CDN 3063 690 series for 690 V AC Technical specifications Voltage ratings 400 VAC phase to neutral or phase to ground 690 VAC phase s to phase s 125 VDC full current range 225 VDC for max 7 A Note
71. e as experienced with a lightning strike Generally speak ing the interference finds its way into household equipment via the mains power supply This kind of interference can affect equipment in either of two ways Firstly the interference can be coupled directly into the equipment via the mains supply The interference is conveyed directly from the source e g lightning strike to external power cables Every item of equipment connected to this power source will be affected by the interference pulses Alternatively the pulses from the source of the interference or its associated mains cables can be coupled into other equipment positioned nearby Surge pulse interference can also occur on signal and data lines through cou pling effects and electrical discharges The system enables tests to be carried out using both coupling methods The EUT is connected to the mains power socket on the front panel of the test system for direct mains injection tests Externally coupled tests require the interference to be superimposed onto signal data line cables via an external TASEO Advanced Test Solutions for EMC 13 coupling unit that is connected to the surge output on the front panel of the System 3 4 Mains quality test The mains quality test includes the simulation of dips and dropouts of the mains power supply in accordance with IEC EN 61000 4 11 and for DC power supplies in accordance with IEC EN 61000 4 29 A voltage dip occurs w
72. e dips up to 300 Cycle 50 Hz AC Power Lines Class 2 Short interruption 0 250 Cycle dips 50 Hz AC Power Lines Class 3 Short interruption 0 250 Cycle dips 60 Hz AC Power Lines Class 2 Short interruption 0 300 Cycle dips 60 Hz AC Power Lines Class 3 Short interruption 0 300 Cycle dips 3333 50HZ Voltage variation 60HZ Voltage variation Dips and drops for DC lines IEC 61000 4 29 2000 DC Voltage Dips 40 0 01 s up to 1 s DC Voltage Dips 70 0 01 s up to 1 s DC voltage interruption 0 0 001 s up to 1s DC voltage variation 85 0 1 s up to 10 S DC voltage variation 120 0 1 s up to 10 s DC voltage variation 80 0 1 s up to 10 s TASEO Advanced Test Solutions for EMC 56 8 2 3 SAVE TEST The Save Test button is used to save the current test to a file for later use Touch the Save Test button A keyboard is displayed Touch the individual keys to enter a file name in the black bar above the keyboard The Delete key will delete all text entered The backspace button lt will delete the last letter entered Touch the Enter button to save the file under the name entered All letters and numbers as well as hyphens spaces and dots can be used in file names The maximum file name is 40 characters including spaces The system automatically generates a file extension to identify the type of test For example all burst tests will are given the extensi
73. e step up in the list Touch the DOWN button to move the step down in the list H DEL Touch a line number to select a step A red frame is displayed around the selected step Touch the DEL button to delete the step H OK Touch the OK button to save all settings and return to the test parameter window H EXIT Touch the Exit button to return to the Test parameter window without saving settings NSG 3040 EMC test system ADD STEP Multi step tests can be programmed manually in the test parameters window using the Add Step button Touch the Add Step button create a new step with the values currently dis played in the Test parameters window The user can program a maximum of 10 test steps When the first test step is programmed TEST 1 X is displayed in the upper right corner and the step can no longer be changed from the Test parameters window To change a step the user must first delete it using the Show Step button then use Add Step to re enter the step Refer to sections 8 3 8 9 for detailed information on setting parameters for specific types of tests EXPERT MODE The Expert Mode button can be used only if Expert Mode is set to On in the System General settings window see section 7 3 Expert Mode is a fast effective method of activating critical threshold values Touch the Expert Mode button to manually adjust test parameters using the wheel whi
74. ep rising and falling edges these interference pulses spread over a frequency spectrum of over 300 MHz and may occur wherever electrical currents are switched off in connection with motors circuit breakers relays fluorescent lamps etc Therefore nearly all the relevant standards concerning the testing of electronic equipment require the performance of burst tests NSG 3040 EMC test system 8 3 1 Test configuration with power line coupling 59 In a power line coupling test the NSG 3040 generates the interference signal which is superimposed on the EUT power signal 8 3 2 Test configuration with external coupling In an externally coupled test the interference signal is delivered through the NSG 3040 s coaxial burst output connector on the front panel and fed to an external coupling clamp The signal is then applied to signal or data line cables The same SHV type connector may also be used for connection of a 3 phase CDN or for a CDN suitable for 1 phase gt 16 A and all other CDNs with a minimum 400 MHz digital oscilloscope to accu D NOTE A Teseq CAS 3025 calibration set must be used rately verify the EFT pulse parameters Single pulse Pulse burst V 100 90 V 50 10 t et tp EI t e lt 20 Ten f Burst rep Burst wave shape and timing definitions tr 5 ns 30 tp 50 ns 30 into 50 0 tp 50 15 ns 100 ns into 1000 Q TASEO Advanced Test Solutio
75. ered via this route for PQT mains quality testing purposes TASEO Advanced Test Solutions for EMC 30 6 2 3 DC EUT input For DC voltages La positive N negative In DC applications the positive and negative lines are to be connected to La and N respectively The polarity at this EUT power input connector will be the same at the EUT output connector The connector s ground contact must be connected to a good solid ground point 6 2 4 Ground connection point This ground terminal provides a solid connection point to the NSG 3040 s chassis ground 6 2 5 System interface connector 25 pin D sub Pin Sync line Signal Remark Working direction ains voltage passes p 7 SyncO Aa EN hrough the zero crossing SE y point with rising signal level Puts the NSG 3060 into an gt 5 sync Interlock idle state The Error LED a AE ights in this state EUT reports a fault to the 6 Sync2 EUT fail SG 3060 software The R RAT 610956 est is stopped 7 To from the active e lemes gen ET sent function module tne y oscilloscope rom Ke BE 8 slave controller and 8 master controller S From external device 17 Sync4 Pulse enable da device stops the o the slave and master controllers 4 Sync5 EUT power OFF Connecting this PIN to From external device GND24S will force the EUT o the slave and power to OFF master controllers ote First EUT power o N 0 0
76. ered with VAR 3005 NSG 3040 EMC test system Oo Connect VAR 3005 EUT power out to NSG 3040 EUT power input m Connect VAR 3005 EUT power in to mains using EUT power in cable delivered with NSG 3040 Because of the capacitors in the internal coupler of NSG 3040 earth leakage currents of up to 4 A can occur in the EUT power supply network The test system must therefore be correctly earthed and be powered from a supply that is not protected by a residual current detec tor RCD m Switch on VAR 3005 first m Switch on NSG 3040 H Switch on EUT power red switch when power for the EUT is required HW Detection The VAR 3005 is automatically detected by the NSG 3040 during the booting process Its presence is visualised in the system settings screen Equipment details CWM 3450 0002 11 22 2 2009 13 2 2009 FTM 3425 0002 11 73 19 11 2010 19 11 2010 YAR 3005 0002 11 1 15 9 2010 18 9 2010 Once a variac detected the function for voltage variations gets active See functionality of variation tests below TASEO Advanced Test Solutions for EMC 117 118 YAR NM VOLTAGE VARIATION Operation In case of a VAR 3005 D16 the Uin field in the window system general ap pears Here Uin EUT supply voltage can be set to any supply voltage General settings Beeper volume Off ARE 230 d Interlock action 2 EUT OFF Expert mode 3 Dips and drops tests The parameter Field Voltage Uvar gets active once a VAR 3005
77. es IEC DCV VARIATION 10S 80 09 10s 3 pulses TASEO Advanced Test Solutions for EMC 90 Basic Standard IEC 61000 4 11 2002 6 2 T Decrease File name implemented Uvar Phase Rep time _ T Event ts td T Increase ti Test duration IEC 50HZ VOLTAGE VARIATION 70 0 10s 25 cycle 3 pulses IEC 60HZ VOLTAGE VARIATION 70 0 10s 30 cycle 3 pulses ANSI C 62 45_ 2002 Combination w ave File name implemented Voltage Polarity _ 1 06 62 06 256 Coupling Rep time Test duration ANSI 1 PH BASIC 1 CAT A1 2000V 2 0 270 90 L N gt PE 10s 10 pulse ANSI 1 PH BASIC 1 CAT A2 4000 V 0 270 90 L N gt PE 20s 10 pulse ANSI 1 PH BASIC 1 CAT A3 6000 V 0 270 90 L N gt PE 20s 10 pulse ANSI 1 PH BASIC 2 CAT A1 2000V 0 270 90 L gt N 10s 10 pulse ANSI 1 PH BASIC 2 CAT A2 4000 V 0 270 90 L gt N 20s 10 pulse ANSI 1 PH BASIC 2 CAT A3 6000 V 0 270 90 L gt N 20s 10 pulse ANSI 3 PH BASIC 1 CAT A1 2000V 0 270 90 L1 L2 L3 N gt PE 10s 10 pulse ANSI 3 PH BASIC 1 CAT A2 4000 V 0 270 90 L1 L2 L3 N gt PE 20s 10 pulse ANSI 3 PH BASIC 1 CAT A3 6000 V 0 270 90 L1 L2 L3 N gt PE 20s 10 pulse ANSI 3 PH BASIC 2 CAT A1 2000V 0 270 90 L2 gt L1 10s 10 pulse ANSI 3 PH BASIC 2 CAT A2 4000 V 0 270 90 L2 gt L1 20 s 10 p
78. field displays the actual EUT voltage when the AC EUT input supply is connected and EUT power is switched On When the input supply is not connected and or the EUT is switched off these fields will display OV The NSG 3040 does not have EUT frequency measuring features 7 6 2 Test action at EUT fail input Touch the Test action at EUT fail input button Stop in the example to specify the test action taken if the EUT fail input on system Interface port is activated When the button is set to Stop and the EUT fail input is activated the test stops The test can be restarted by pressing the Start key on the front panel When the button is set to Pause and the EUT fail input is activated the test goes into pause mode The test can be continued by pressing the Start key on the front panel When the button is set to CONT the test will continue even if the EUT fail TASEO Advanced Test Solutions for EMC 42 7 6 3 EUT power supply at EUT fail input Touch the EUT power supply at EUT fail Input button Off in the example to specify the action taken if an EUT fail signal is generated when the button is set to On EUT power stays on after the EUT fail Input is activated When the button is set to Off EUT power shuts down when the EUT fail Input is activated 7 6 4 Exit Touch the Exit button to return to the system window without saving changes 7 6 5 EUT on This button displays t
79. for in IEC 61000 4 11 2004 standard mechanisms it is strongly recommended to power on first the INA 6502 accessory and then the NSG 3040 Powering on the NSG 3040 main frame before the acces sories may result in non detection of accessories For proper operation of the plug and play detection Operation The parameter field voltage Uvar gets active once an INA 6502 has been de tected by the software The entry of Uin is by default 230 V and may be set to other voltages this can be done in the system general windows Uvar can be selected for one of the 4 available variable voltage levels 0 40 70 80 Circuit diagram INA 6502 EUT Power ON OFF Circuit Breaker Option CIB L Be _ Uin 16 A f r j Uvar or NC i z FE eur E i g e h Power N et oe y OUT 0 40 70 80 EUT Power ON OFF Power X Supply 4 Supply Interface Controller 3 Remote Test EUT Plug XI System cable IN Plug X2 System cable OUT Power OFF 25 Way Sub D Male 25 Way Sub D Female Connection to NSG Termination with MaterController via Interlock plug System Interface cable TASEO Advanced Test Solutions for EMC 130 Technical specifications INA 6502 Input voltage 0 to 250 VAC not suited for DC voltages Output voltage 4 steps 0 40 70 80 Accuracy EE Voltage change with load 100 output O to
80. frequencies in a single pulse makes the calibration of EMC pulse generators particularly demanding and difficult Teseq has one of the few accredited test laboratories in Europe that is in the position to undertake calibrations in this specialized field TASEO Advanced Test Solutions for EMC 106 12 5 Warranty Teseq grants a warranty of 2 years on this test system effective from the date of purchase tiona During this period any defective components part will be repaired or replaced free of charge or if necessary the test system will be replaced by another of equivalent value The decision regarding the method of reinstating the func capability is at the sole discression of Teseq Excluded from the warranty is damage or consequential damage caused through negligent operation or use as well as the replacement of parts subject to degradation The warranty is rendered invalid by any intervention on the part of the customer or a third party The faulty items have to be returned in their original packagin ga Teseq accept no responsibility for damage in transit NSG 3040 EMC test system 13 DECLARATION OF CONFORMITY CE w Declaration of conformity Manufacturer Address Product Options Generic standards Technical file THSEO Advanced Test Solutions for EMC Teseq AG Nordstrasse 11F 4542 Luterbach Switzerland T 41 32 681 40 40 F 41 32 681 40 48 www teseq com Teseq AG
81. has been detected by the software Uvar can be selected for one of the 4 available variable voltage levels 0 40 70 80 NSG 3040 EMC test system Dips and Drops test Voltage UT OFF U var d 70 Phase M reyni T Event 10 ns CH 4 SHOW STEPS Repetition Test Time wl Duration dr i R 1 Voltage variations tests Voltage variations tests 119 Voltage variation tests are specified in 5 2 of IEC 61000 4 11 and are avail able with NSG 3040 as soon an automatic variac is detected by the system software Description of voltage variation test extract of IEC 61000 4 11 UT r m s 100 70 0 4 Key ty Time for decreasing voltage t Time for increasing voltage t Time at reduced voltage The respective test screen looks like what follows TASEO Advanced Test Solutions for EMC 120 Voltage Variation test EM T 70 x R 1 Phase 2 o sma Ti 25 kon I MJ 2 3 EUT OFF ADD STEP MBS Oe 14 3 2 Manual variac VAR 6503 The manually operated variable transformer type VAR 6503 is a standard ac cessory for the Teseq NSG 3040 instrumentation series It provides a conve nient means for reducing the incoming supply voltage to arbitrary levels set by the user It is required for power quality testing PQT purposes where the current drawn does not exceed 8 Arms It is compliant with the latest revi
82. he EUT input power status 7 6 6 Ok Touch the Ok button to save changes and return to the system window 7 7 SD card properties This feature is not yet implemented DI This function is actually not supported SD card properties window The NSG 3040 includes an integrated SD card slot which can be used to down load software updates NSG 3040 EMC test system 7 7 1 Viewing the current SUI version The current SUI software version is displayed in the equipment detail window To access this window 1 Touch the system button in the main menu to display the system window 2 Touch the equipment button to display the equiment detail list TASEO Advanced Test solutions for EMC Tess EH Q wem u pies a VARA PULSED POWER pr L g Le 49 Witz ie EZ Ce EE M ES r System button in the main menu System window Equipment button in the system window Equipment details SUI3000 080922 Identifies the SUI version NA NA NA MODMC_MU 0001 27A 513 NA NA CDN3041 0001 15f 19 1 8 2008 1 8 2008 Wiese PQM3403 0001 15f 359 8 2 2008 8 2 2008 V Bayer HYM3040 0001 15f 161 NA NA NA Equipment detail list with SUI software version displayed TASEO Advanced Test Solutions for EMC 43 A4 7 7 2 Updating SUI software via the SD card To change the SUI software first switch off the generator and remove all power cords and cables Open the top housing cover of
83. he type of field produced surge pulses such as those occurring during lightning strokes on buildings and other metallic structures such as free standing masts lightning conductors earth networks etc NSG 3040 generates these test signals in accordance with the IEC 61000 4 9 standard by inducing a current generated by the surge module CWM 3450 into magnetic field loop in which the magnetic field produced in proportional to the current within the loop parameters TASEO Advanced Test Solutions for EMC 133 134 It is recommended for the user to stay away at least a few meters from the loop antenna while magnetic fields are generated Also keep away magnetic field sensitive devices and items such as credit cards mag netic key cards etc which might be influencedby the field Magnetic field loops INA 701 702 and INA 703 Tests with mains frequency and pulsed magnetic fields are performed using the magnetic field loops designed for NSG 3040 These are rectangular loops measuring 1 x 1m and are suitable for test objects with dimensions up to 0 6 x 0 6 x 0 5 m X w X h Three types of loop can be supplied The INA 701 is a 1 x 1 m loop single turn with a coil factor of 0 89 It enables the generation of field strengths of up to 3 6 A m for mains fre quency fields 50 or 60 Hz when used with the MFO 6501 or MFO 6502 current sources and 1200 A m for pulsed magnetic fields where the current is gener ated by a 4400 V
84. he wheel or the keypad 8 4 4 Impedance Touch the impedance button 2 ohms in the example it will repetitively change between 2 and 12 Q 8 4 5 Phase Touch the Synch Asynch button Asynch in the example to activate the syn chronization of test pulses to the EUT mains frequency When this button is set to Asynch the phase value button in the example will display When this button is set to Synch the user must also set the phase value NSG 3040 EMC test system To set the phase value touch the phase value button A red frame is displayed around the field The phase value may be entered using the wheel or the keypad The value is in degree units and may range from 0 to 359 Synch mode is only available if the EUT power is switched on 8 4 6 Coupling Touch the coupling mode button to select SURGE OUTPUT MANUAL CDN or IEC COUPLING Surge output Select SURGE OUTPUT when a pulse is to be applied directly to the EUT for example in component testing of non powered EUTS Manual CDN This setting will compensate the loss of an external manual CDN such as the CDN 3083 or CDN 117 The internal impedance will be reduced by 0 37 0 IEC coupling When IEC coupling is selected the window in figure below displayed ouch the individual High and Low output coupling buttons L N and PE in the example to select an open or closed relay ouch OK to enable the coupling select
85. hen the supply voltage falls considerably below the nominal level for a relatively short time e g for a few cycles whereas a dropout means that the voltage falls to Zero for a similar period 3 5 Magnetic fields with mains frequency option ains frequency magnetic field tests or POWERM tests involve the simulation of the magnetic fields typically generated by the current flow in power supply cables as specified in IEC EN 61000 4 8 Such magnetic fields can affect the operation of items of equipment that are sensitive to them The NSG 3040 performs this test by causing a heavy current to flow in a magnetic field coil such that the current and frequency produce a proportional field within the coil parameters The magnetic field coils available as accessories are connected to the mag netic field option MFO which in turn is connected to the system 3 6 Pulsed magnetic fields option Tests with pulsed magnetic fields or PULSEM tests simulate the type of inter ference produced by surge pulses as a result of lightning strikes to buildings and other metallic structures such as freestanding masts ground conductors grounding networks etc as specified in IEC EN 61000 4 9 Magnetic fields of this type can upset the operation of installations that find themselves within such fields The NSG 3040 erforms this test by causing a heavy current to flow in a magnetic field coil such that the amplitude of the pulse current produce a proportion
86. ic standard IEC 61000 4 4 The EFT bursts coupling clamp CDN 3425 is to be used with a IEC 61000 4 4 compliant EFT burst generator The IEC EN 61000 4 4 standard also permits the capacitive coupling method to be used for pulse injection into AC and DC power supply cables when no suitable decoupling network is present The coupling capacitance between the coupling clamp and the cable laid in it depends on the type of cable its diameter and various other factors such as screening etc The option INA 3825 Safety cover with Interlock is available which avoids the user to touch the conductive plate of the CDN 3425 while EFT burst pulses get applied Preparation for operation The test rig is to be constructed in accordance with IEC EN 61000 4 4 with special reference to Operation preferably in a screened room to protect the environment NSG 3040 EMC test system Distances to the EUT and peripherals to be as specified in the standard 149 Good and large area contact to the earth plane Tests on uninsulated cables is not permissible Operation Connect the delivered HV pulse cable to the pulse output of the used EFT burst generator If INA 3825 accessory is used connect the Interlock cable to the interlock input of your generator use the INA 3825 to cover the CDN 3425 the way the interlock switch rear side middle gets activated Start the EFT burst test Follow instructions of EFT burst generator user man ual Me
87. imulate the high voltage high frequency interference pulses typically produced when an inductively loaded switch is operated Without countermeasures such interference may occur when a current through an electromagnetic device e g motor circuit breaker relay fluorescent lamp etc is switched off This type of interference can affect other equipment in either of following two ways Firstly the interference can be coupled directly into the target equipment via the mains power cable The interference can be transmitted from the source NSG 3040 EMC test system along the mains power cable connected to the target Interference from the mains can reach any other piece of equipment connected to the same power source in a similar way however this does not all have to occur in the same section of a building Alternatively the interference can be capacitively coupled into any target device in the vicinity The system enables a test to be performed using both standardized coupling methods The EUT is connected to the mains power socket on the front panel of the test system for the direct mains injection test Capacitively coupled tests require the interference to be superimposed onto the signal or data line cables via an external coupling clamp that is connected to the burst output on the front panel of the system 3 3 Combination wave test The surge test in compliance with IEC EN 61000 4 5 duplicates high voltage high energy interferenc
88. ing attenuation Standard conform pulse Mains decoupling Connections EUT supply EUT VAC EUT VDC EUT current EFT burst Value 85 265 VAC Remanent pulse 15 max Mains side crosstalk 15 max 1 2 50 US up to 4 4 kV 8 20 US up to 2 2 kA 1 5 MH Pulse input s from generator Cable connector for EUT supply input and output Power inlet for CDN 1 phase P N PE 50 to 270 V rms 50 60 Hz Phase Neutral 400 Hz max 0 to 270 VDC 1x 16 A rms continuous over heat protected 1 X 25 A rms for 30 min Standard coupling all lines to HF refe rence ground GND IEC EN 61000 4 4 and ANSI IEEE C62 41 L N PE gt GND Any lines and combination to ref GND L gt GND N gt GND PE gt GND LIN gt GND L PE gt GND N PE gt GND TASEO Advanced Test Solutions for EMC Combination wave pulse PONE NSG 3040 EMC test system Line to line 2 0 L gt N L gt PE N gt PE IEC EN 61000 4 5 Lines to ground 12 Q L gt PE N gt PE L N gt PE IEC EN 61000 4 11 4 29 Dips 8 drops to phase L 11 VARIOUS NSG 3040 VERSIONS 97 HH Thanks to a very flexible design concept NSG 3040 is available in several con figurations in order to cover every need between a high end wide applica tion coverage solution multifunction generator and dedicated single function instrument 11 1 NSG 3040 IEC NSG 3040 IEC is the high end configuration It is fitted with pulse modules for dips drops combined wave surge and bur
89. ion and close the window ouch Cancel to close the window without saving the coupling selection ouch Show Graphics to display a graphical example of the coupling selection TASEO Advanced Test Solutions for EMC 71 72 EC coupling selection window 8 4 7 Repetition time Touch the Repetition time button 60 s in the example to set the test repeti tion time A red frame is displayed around the field The repetition time may be entered using the wheel or the keypad Touch the units button s in the example to set the time unit Time units are s and min 8 4 8 Test duration Touch the Test duration button 10 in the example to set the test duration time A red frame is displayed around the field The duration time may be entered using the wheel or the keypad Touch the units button pulse in the example to set the unit Unit values are pulse and cont continuous 8 4 9 Surge generator technical data Parameter Value Pulse voltage open circuit 200 V to 4 4 kV in 1 V steps Pulse current short circuit 100 A to 2 2 kA Impedance 21 60 Polarity Positive negative alternate Phase synchronization Asynchronous synchronous 0 to 359 in 1 steps NSG 3040 EMC test system Coupling IEC external manual Pulse repetition 10 600 s in 1 sec steps 1 10 min Test duration 1 to 9999 pulses Continuous Repetition rate depends on
90. ips ing should be retained in the event that the instrument or any of its accessories should need to be returned to a Teseq service center for repair or calibration NOTE Do not dispose of packaging materials All packag Using the following list check that all the items ordered have been delivered NSG 3040 generator User manual may be a pdf on WIN 3000 CD 1 Mains power cable for the test system 1 Dummy plug interlock blind connector 1 Grounding strip 10 cm 1 EUT power input connector with cable 1 EUT power output connector WIN 3000 CD and LAN crossover cable Optional items as ordered WO md nm bd Check the instrument for signs of transport damage Any damage should De reported to the transportation company immediately TASEO Advanced Test Solutions for EMC 22 5 1 Installation of the NSG 3040 system The mains power voltage indicated on the instrument must correnspond with the local supply voltage mains voltage 85 265 VAC universal power unit mains frequency 50 60 HZ Voltage 85 255 VAC Frag range 5060 Hr Mains switch Fuse holder with fuses 2 x 3 15 AT H Mains power input Mains switch fuse holder and power input To replace a fuse 1 2 Disconnect the mains cable Pull the fuse holder out of the connector 3 Remove the damaged fuse s 4 Insert 1 or 2 x 3 15 AT fuses 5 Replace the fuse holder 6 Plug the mains cable into a power outlet with a solid ground connection
91. irs can be performed both in differential and common mode coupling line to line and line to ground The user can manually select coupling modes by connecting the surge generator s output to the appropriate input of the CDN 117 Several CDN 117s can be arranged in parallel for applications in which more than two conductors must be decoupled The CDN 117 can be easily interfaced with the EUT and is designed as a bench top unit It can be used with Teseq s NSG series or any industry stan dard surge generator with the appropriate connector adapter TASEO Advanced Test Solutions for EMC 152 Technical specifications Signal line Max operating voltage AC 250 V DC 250 V Max operating current 1 5 A Ohmic resistamce per path 250 Decoupling chokes 1 KHz 20 mH nominal Pulse 1 2 50 us pulse Max pulse voltage 6 6 kV Accessories Series resistor 2x 400 6W Coupling adapters INA 170 Sparkling gap device 90 V trip voltage INA 171 Capacity 0 1 uF spark gap device 90 V trip voltage INA 174 Capacitor 0 35 UF 14 6 3 Surge pulse CDN for symmetric datalines CDN 118 Teseq s CDN 118 coupling decoupling network is designed for conve nient surge testing of telecommunications equipment to IEC EN 61000 4 5 which specifies a 1 2 50 or a 10 700 us pulse The CDN 118 includes the special decoupling network and coupling elements that are required for these tests The CDN 118 can be easily interfaced with the EUT and is designed as
92. is displayed around the field Enter the Start value using either the wheel or the keypad H Stop Touch the Stop button 4800 V in the example A red frame is displayed around the field Enter the Stop value using either the wheel or the keypad H Step Touch the Step button 1 V in the example A red frame is displayed around the field Enter the Step value using either the wheel or the keypad TASEO Advanced Test Solutions for EMC 49 H Step delay Touch the Step delay button 17 in the example A red frame is displayed around the field Enter the Step Delay value using either the wheel or the keypad Touch the Unit button s in the example to set the step delay unit The step delay depens on pulses and the minimum repetition rates OK Touch the OK button to save all settings and return to the test parameter window EXIT Touch the Exit button to return to the test parameter window without saving settings SHOW STEPS Touch the Show Steps button to view change the order of or delete individual test steps The show step window displays individual test steps in the order that they will be executed H UP DOWN Use the UP and DOWN arrowsonthe right side ofthe Show Step window to change the test step order Touch a line number to select a step A red frame is displayed around the selected step Touch the UP button to move th
93. isualised in the system settings screen Equipment details CWM 3450 0002 11 22 2 2009 13 2 2009 FTM 3425 0002 11 73 19 11 2010 19 11 2010 INA 6502 0002 10 4267 23 11 2009 14 2 2011 Operation The parameter Field Voltage Uvar gets active once an INA 6502 has been detected by the software The entry of Uin is by default 230 V and may be set to other voltages this can be done in the system general windows Uvar can be selected for one of the 4 available variable voltage levels 0 40 70 80 NSG 3040 EMC test system Dips and Drops test m0 os 2 O Phase a o sna Event ai 10 ms w H R 5 ru E S R R 14 4 Magnetic field options Magnetic fields at mains frequency Mains frequency magnetic fields simulate the kind of stray fields that occur around current carrying power supply lines NSG 3040 together with MFO 6501 or MFO 6502 Current sources generates these test conditions in accordance with the IEC 61000 4 8 standard by in ducing a current into a magnetic field loop The magnetic field produced is proportional to the current within the loop parameters IEC 61000 4 8 speci fies a clean sine wave to be used THD lt 8 This is met thanks to the use of a synthetic signal generator together with an audio current amplifier Other advantage of this solution is that both 50 and 60 Hz fields can be generated by the same instrument Pulsed magnetic fields Tests with pulsed magnetic fields simulate t
94. ld Cfthe coil factor I the current flowing through the loop The unit has been designed for use in rugged industrial environments Pro fessional quality connectors ensure user safety additional system protection is provided by a temperature sensor located on the heatsink of the power amplifier MFO 6502 is designed to drive INDUCTIVE LOADS ONLY as magnetic field loops NSG 3040 EMC test system m Connecting capacitive loads will destroy the Instrument 143 mechanisms it is strongly recommended to power on For proper operation of the plug and play detection first the MFO 6502 accessory and then the NSG 3040 Powering on the NSG 3040 before the accessories mayresult in a non detection of the accessories Circuit diagram MFO 6502 L 0 Red Mains Power supply input 15V 0V 15V Black Power amplifier Sine wave Signal generator 50 Hz Amplitude Low High 60 Hz control range Controller Plug X1 System cable IN Plug 2 System cable OUT 25 Way Sub D Male 25 Way Sub D Female Connection to NSG master Termination with NSG Interlock controller via system interface plug cable TASEO Advanced Test Solutions for EMC 144 Technical specifications MFO 6502 Parameter Total harmonic distortion THD Frequency Magnetic field adjustment Range low Range high Supply voltage Power consumption Opera
95. le a test is in progress Expert Mode only for burst pulse The Expert Mode allows the user to change parameters during a running test if this mode is set Active in the system setting For safety reasons in the in the burst menu the expert mode needs to be activated as well The Expert Mode can be activated only for the following parameter H Volt please note the voltage change is only possible if the polarity is set to Negative or Positive H Frequency H Phase H Burst time TASEO Advanced Test Solutions for EMC 51 52 Burst Electrical Fast Transient test Burst c ell output Volt at 200 v Burst Time 75 ste a g Repetition Frequency d 12 Time 300 ms x ee DES ve Phase a GG roynd uration 120 s j ADD STEP 5 DT A selected test can be started During run mode the changeable parameter can be touched the value window is highlighted with a red frame like the voltage frame shown in the examples above The value can now be changed via wheel and by pressing again the START button the value will be accepted and on the pulse output the new value is displayed 8 2 The bottom bar 8 2 1 LOAD USER TEST Touch the Load User Test button to display a list of all test files that have been created and saved by the user Only files for the selected test type are displayed Figure 8 5 shows the load user test window with several burst tests displayed The user can
96. lect the required voltage ensure easy and intuitive operation The unit has been designed for use in rugged industrial environments Profes sional quality connectors ensure user safety additional system protection is provided by a 16 A fuse located in the front panel Thanks to the provision of an 80 voltage position and to the large overcur rent capabilities the step transformer is fully compliant with the latest require ments called for in IEC 61000 4 11 2004 standard NSG 3040 EMC test system 125 INA 6501 Step transformer F1 i L 1black i black 3 L brown 3 Lvar 0 blue 2 N S1 N 2 blue gt lt Ye Gr Ye Gr Technical specifications INA 6501 Input voltage 0 to 250 VAC not suited for DC voltages Output voltage 4 steps 0 40 70 80 Accuracy 5 Voltage change with load 100 output Oto 16 A less than 5 80 output O to 20 A less than 5 70 output 0 to 23 A less than 5 40 output 0 to 40 A less than 5 Output current capability at 230 V input voltage 16 Arms at 100 output 20 Arms at 80 Output 23 Arms at 70 output 40 Arms at 40 output TASEO Advanced Test Solutions for EMC 126 Voltage selection Friont panel rotary switch EUT power on off function Front panel switch with on indicator Fuse 16 A slow blow Connectors Harting type HAN3A Power Supply Selectable 100 110 V 220 240 V 15 VA Size 150 x 180 x 360 mm Weight 12 kg approx Output cable length
97. lot TASEO Advanced Test Solutions for EMC 45 46 Removing the SD card fr 9013000 SEE ar File Edit View Favorites Tools Help Address F fAutoCopytProgram 5655013000 v Go Folders Name Size Type Date Modified E Removable Disk F A fihSUI3000AP 15546KB Application 19 05 2008 13 11 EJ AutoCopy E D Program Files 5013000 Windows explorer displaying the SUI program filename SUI3000AP EXE on the SD card re movable disk F H NOTE Do not change the SUI program filename NSG 3040 EMC test system 7 8 Language 47 Language Selector Language selector window Touch the Language button to open the language selector window The SUI software can be displayed in English German French Japanese or Chinese Note Only English is available at this time The NSG 3040 will automatically reboot if the language is changed OK Touch the OK button to save all settings and return to the system window EXIT Touch the Exit button to return to the system window without saving set tings TASEO Advanced Test Solutions for EMC 48 O 8 SETTING TEST PARAMETERS HE The main menu displays a button for every type of test that can be performed by the NSG 3040 Buttons for tests that are not available on the system as configured are greyed out The user can set parameters for available tests and create new tests in the test parameter window The next figure
98. mpedance Accuracy MD 300 set Options INA 6560 INA 2042 INA 6554 5000 Amp gt 63 Amp 500 1 into 1 MO system 1000 1 into 50 O system 0 002 V Amp MQ system 0 001 V Amp Q system 8mm SMA with SMA and BNC connectors 10 5590 500 lt 2 Carry case current probe coax cable with SMA BNC connector shorting cable with safety banansa connectors calibration certificate user manual FISCHER to banana plug adaptor set LEMO to banana plug adaptor set IEC 320 single phase to safety banana adaptor leads 2 x 155 131 6 to 4 mm adaptors with safety banana connectors Note The carry case provides spare place for all options TASEO Advanced Test Solutions for EMC 158 14 7 3 Burst EFT pulse verification kit The Teseq CAS 3025 burst EFT pulse verification kit has been specially de signed to comply with the new requirements of IEC EN 61000 4 4 2004 to enable EMC engineers to verify their burst EFT test generators periodically Annual calibration and periodic verification The annual calibration of test equipment recommended by most quality sys tems ISO 9000 ISO 17025 etc has to be considered as a validation of all measurements done since the last calibration Many EMC standards call for a verification of the test equipment before and after every test session If the verification shows differing results no valid test results can be assumed and the test equipment has to be re calibrated NSG 3040
99. mplies to the requirements of IEC 61000 4 8 TASEQ MAGNETIC FIELD GENERATOR H Ce NE UZ It is fitted with carrying handles as part of its overall good ergonomic design which makes for ease of handling Further the unit may be used in any oftwo operating positions laying on a work bench or for more permanent applica tions it can be wall mounted Its control is fully automatic driven from NSG 3040 Once detected by the NSG 3040 the functions offered by MFO 6502 are available in the software Follow ing icon will be darkened showing the functions are active gt POWER JU MAGNETIC 50 80 FIELD 50 60 Hz TASEO Advanced Test Solutions for EMC 141 142 The coil factor of the used loop antenna is to be entered in the respective field then the user will setup his tests directly in A m the software makes the calculation and drives the MFO 6502 to generate the right current through the loop antenna Power Line Magnetic Field test Field Zal Strenght a 1 Factor Test Frequency 50 Hz Duration Two safety banana sockets red and black provide a convenient means to connect the loop antenna two other ones green shorted by jumper to connect an external amp meter for verifying or to calibrate the generated current as the field generated in the loop antenna is directly proportional to the current flowing through it Field strength A m H Cfxl Where H is the generated fie
100. nput voltage Output voltage Accuracy Voltage selection EUT power on off function Fuse Connectors Size Weight Output cable length Input cable Value 0 to 250 VAC not suited for DC voltages Adjustable from 0 to 100 of input voltages Depending on DVM used Max 8 A Friont panel switch with on indicator 8 A Slow blow Harting type HAN 3A 150 x 180 x 360 mm 12 kg approx 2 meter NSG 3040 standard cable to be used Installation connection to NSG 3040 The equipment should be switched off during installa gt tion and interconnection m Connect VAR 6503 EUT power out to NSG 3040 EUT power input m Connect VAR 6503 EUT power in to mains using EUT power in cable delivered with Modula m Connect external DVM if accurate setting is required 3040 earth leakage currents of up to 4 A can occur in Because of the capacitors in the internal coupler of NSG the EUT power supply network The test system must therefore be correctly earthed and be powered from a supply that is not protected by a residual current detec tor RCD NSG 3040 EMC test system m Switch on EUT power red switch on VAR 6503 when power for the 123 EUT is required D Select the required variable voltage using knob on VAR 6503 D Switch on NSG 3040 Operation The NSG 3040 operation software does not know that an external variac is connected The user interface software in the dips and drops test will always show external
101. ns for EMC 60 8 3 3 Burst parameters window Burst window Volt D 200 V Burst Time_ 15 el Frequency 5 x TR 300 el HALES ad ama Duration 120 s oe Burst parameter setting window 8 3 4 Voltage Touch the Polarity button ALT in the example to select test polarity Polarity values are positive POS negative NEG or alternating ALT On odd pulse number there will be one pulse less in negative then in positive Positive pulse will be first executed Touch the Voltage button 200 V in the example to enter the test voltage A red frame is displayed around the field The voltage value may be entered using the wheel or the keypad 8 3 5 Frequency Touch the Frequency button 5 in the example to set the test frequency A red frame is displayed around the field The frequency value may be entered using the wheel or the keypad Touch the units button KHz in the example to set the frequency unit Frequency values are Hz and KHz 8 3 6 Phase Touch the Synch Asynch button Asynch in the example to activate the syn chronization of test pulses to the EUT mains frequency NSG 3040 EMC test system When this button is set to Asynch the phase value button in the example will display When this button is set to Synch the user must also set the phase value To set the phase value touch the phase value button A red frame is displayed around the field The phase v
102. nterfaces of the NSG 3000 series per front panel display or via WIN 3000 PC software VAR 3005 is plug and play technology it auto configures and avoids the user to set voltages out of range Electrical performance parameters are in line or exceed the requirements of the basic standard IEC 61000 4 11 2004 and so for allow EMI dips drops and variations tests for every type of equipment with current ratings below 16 A Thanks to internal advanced microprocessor based control electronics VAR 3005 features permanent self regulation self check mains voltage check phase rotation check and informs the user or stops the test if the surrounding conditions are not given to guarantee a proper testing EUT power can be switched ON and OFF manually per switch on front panel or remotely from NSG 3000 front panel or PC control software EUT power can be switched off automatically at test end per sequencing program control For safety reasons EUT power will switch off automatically in case of overload VAR 3005 is also available as single source providing best price performance for applications where dual source is not required mains supply of equipment under test is fixed value NSG 3040 EMC test system Available models VAR 3005 D16 Dual 0 to 265 VAC 16 A source VAR 3005 S16 Single 0 to 265 VAC 16 A source Technical specifications Parameter Value Specification Per IEC and EN 61000 4 11 2
103. o partition networks into segments Devices on a subnet share a contiguous range of IP address numbers A subnet mask defines the boundaries of an IP subnet and hides the network address portion of an IP address For example if a network has a base IP address of 192 168 0 0 and has a subnet mask of 255 255 255 0 then any data going to an IP address outside of 192 168 0 X will be sent to that network s gateway The correspondence between subnet masks and IP address ranges follows defined mathematical formulas by assigning a value of 1 to every digit in the network address portion of the binary IP address These masked digits are not permitted to change when assigning IP addresses to devices on the local area network TASEO Advanced Test Solutions for EMC 39 40 Touch the SubNet button to enter the subnet mask A red frame will be dis played around the field Enter the subnet mask using the wheel or keypad Gateway A gateway is a node on a network that serves as an entrance to another network In enterprises the gateway is the computer that routes the traffic from a workstation to the outside network that is serving the Web pages In homes the gateway is the ISP that connects the user to the internet n enterprises the gateway node often acts as a proxy server and a firewall The gateway is also associated with both a router which use headers and forward ing tables to determine where packets are sent and a switch which p
104. of IEC EN 61010 1 Safety requirements for electrical equipment for measurement control and laboratory use It is the user s responsibility to ensure that the test rig does not emit excessive electromagnetic interference EMI that might affect other equipment The test TASEO Advanced Test Solutions for EMC system itself does not produce any excessive radiation however the injection of interference pulses into the EUT can result in the device and or its associated cables radiating EMI To avoid radiating unwanted interference the standards organzations recommend that the test setup be located in a Faraday cage Since the purpose of the test system is to produce interference signals for interference immunity testing the requirements in the IEC EN 61000 series concerning limiting the radiated EMI can only be complied with by operating the test system inside a Faraday cage 4 5 Test execution unauthorized persons do not have access during the execution of a test If a safety contact Interlock is used as a means of access control to the test zone e g a Faraday cage then an additional contact connected in series is necessary to provide protection for parts of the EUT that are likely to be touched accidentally M WARNING The test area must be organized so that During a test the EUT together with its accessories and cables are to be considered live at all times The test system must be stopped and the EUT supply discon ne
105. on EFT Touch the Cancel button to return to the test parameter window without saving the file E EJ BE es a a SS a lt Space Del _ Enter Save Test keyboard HE NSG 3040 EMC test system LONGTERM TEST LEVEL2 COUPLING ON L1 PE Keyboard with filename entered KEYPAD Touch the Keypad button to display a numeric keypad The Keypad button is active only when the user has selected a parameter that requires a numeric entry Touch individual numbers to enter them touch C to clear an entry and touch Enter to enter the value in the field After touching Enter the keypad will close Keypad TASEO Advanced Test Solutions for EMC 57 58 SHOW GRAPHICS ouch the Show Graphics button to display waveforms coupling diagrams and other graphical information for the selected test ouch the More button to view additional information ouch the Back button to view previous graphics Touch the Exit button to return to the Test parameters window Example burst pulse graph 8 3 Burst parameter setting The generation of high voltage bursts and high frequency pulses is part of the EFT burst package test required in the international standard EN IEC 61000 4 4 The test NSG 3040 generates bursts of interference that simulate the interfer ence that is generated when inductively loaded switches are operated With their very ste
106. ons The NSG 3040 must be installed and used only by autho rized and trained EMC specialists Personnel fitted with a heart pacemaker may not operate the instrument and must not be in the vicinity of the test setup while it is in operation When the system is used in conjunction with options accessories or other equipment the safety instructions concerning those devices must also be observed NSG 3040 EMC test system 1 EXPLANATION OF SYMBOLS HHI Please take note of the following explanations of the symbols used in order to achieve the optimum benefit from this manual and to ensure safety during operation of the equipment The following symbol draws your attention to a circumstance where non observation of the warning could lead to inconvenience or impairment in the performance Example This connection must not be confused with the Equip ment under Test EUT power input The following symbol draws your attention to a circumstance where non observation of the warning could lead to component damage or danger to the operating personnel Example Never connect or disconnect the EUT while the test H system is performing a test TASEO Advanced Test Solutions for EMC 10 O 2 INTRODUCTION H 2 1 General description The NSG 3040 test system is a multifunction generator that simulates cable borne electromagnetic interference effects for immunity testing to interna tional national and manufacturers stan
107. ons for EMC 15 16 WARNING NSG 3040 is not suitable for use in an explo sive atmosphere WARNING Personnel fitted with a heart pacemaker must neither operate the instrument nor approach the test setup while a test is being executed Only approved accessories connectors adapters etc are to be used to ensure safe operation WARNING Connect the EUT only after the initial system H self test has finished 4 2 Installation The NSG 3040 test system conforms to protection class 1 Local installation regulations must be respected to ensure the safe flow of leakage currents WARNING Operation without a ground connection is H forbidden Two independent ground connections are necessary one for the test system and one for the EUT These must be connected back to the local permanent installation or to a fixed permanent ground conductor Operate the equipment only in dry surroundings Any condensation that occurs must be allowed to evaporate before putting the equipment into operation Do not exceed the permissible ambient temperature or humidity levels Use only officially approved connectors and accessory items Ensure that a reliable return path for the interference current is provided between the EUT and the generator The ground reference plane and the ground connections to the instruments as described in the relevant test standards serve this purpose well NSG 3040 EMC test system The test system ma
108. other CDNs max 30 Front time T1 1 67 x T 1 2 US 30 Time to half value T2 50 us 20 Wave shape of open circuit voltage 1 2 50 us wave shape definition according to IEC EN 61000 4 5 NSG 3040 EMC test system 69 max 30 Front time T1 1 25 x T 8 US 20 Time to half value T2 20 us 20 Wave shape of short circuit current 8 20 us wave shape definition according to IEC EN 61000 4 5 WARNING Using improper equipment when measuring DR surge pulses can result in personal injury or equipment damage NOTE Teseq recommends using a Teseq MD 200 or MD 200 A differential probe in combination with a Teseq INA 3236 Fischer to banana adapter for surge pulse verification TASEO Advanced Test Solutions for EMC 70 Combination Wave Surge test Surge e end Mam Impedance 29 Repetition so s 4 Test Phase aa Duration 10 24 Bij ij Oe al CW Parameter window ADD STEP 8 4 3 Voltage Touch the polarity button ALT in the example to select test polarity Polarity values are positive POS negative NEG or alternating ALT On odd pulse number there will be one pulse less in negative then in positive Positive pulse will be first executed Touch the voltage button 200 V in the example to enter the test voltage A red frame is displayed around the field The voltage value may be entered using t
109. ower connectors even the screws are linked to the protective earth TASEO Advanced Test Solutions for EMC 19 20 4 7 Dangers concerning the EUT WARNING Users must be aware of the following dangers that can occur during testing H EUTs are often functional samples that have not yet been subjected to safety tests It is therefore pos sible that the EUT could be damaged by internal overloads or may even start to burn AS soon as the EUT shows signs of being disrupted the test should be stopped and the power to the EUT switched off Internal disruption of the electronics can result in the interference voltage or the EUT supply voltage being present on the EUT s outer casing Electrical breakdown or arcing from connections that are overstressed voltagewise during the test Explosion of components with fire or fragmentation as a result of energy dissipated e g from the resul tant supply current or ignition of vaporized plastic materials Faulty behaviour by the EUT e g a robot arm strikes out or a temperature controller fails etc NSG 3040 EMC test system 5 FIRST STEPS 21 Pen This chapter contains a short checklist with steps that should be taken before the instrument is switched on and put into operation Check the packaging for signs of damage in transit Any damage should be reported immediately to the transportation company Lift the NSG 3040 test system out of its packaging by grasping of the mounted gr
110. pplies allows to test DC powered EUTs on a similar way This is in line with the specifications of IEC 61000 4 29 TASEO Advanced Test Solutions for EMC 73 74 8 5 1 Examples of dips drops u 70 a Voltage dip 30 u 40 4 1 t cycles b Voltage dip 60 u t cycles c Voltage dip 100 8 5 2 Dips and drops generator Dips and Drops Window Voltage U var 0 Phase S noch T Event Si 10 ms Repetition Test SHOW STEPS Time at 10 s Duration 3 Pulse 3 i B K o SE Dips and drops window NSG 3040 EMC test system 8 5 3 Voltage U Var If no automatic variac or automatic transformer is connected then the voltage dip or drop will always occur to 0 Touching the units repetitively it will change from to Volts If a manual voltage source is connected then the dips drops level will follow the manually set voltage at the EUT input 8 5 4 Phase Touching the Phase field it will come up with a red frame to indicate the selected parameter is ready for change The value can be modified either with the red wheel or using the keypad Touching the Synch Asynch button it will change repetitively In synch mode the angle can be modified either with the red wheel or using the keypad Synch mode is only available along with a automated CDN and if the EUT power AC is switched on 8 5 5 Repetition time Touching the Repetition Time field it will come up with a red frame
111. r supply The following error message will be displayed when an invalid combination of parameters is entered Communication Error accept parameter NACK 13 UNSUCCESSFUL COMMAND Invalid parameter error message TASEO Advanced Test Solutions for EMC 64 The following graphs show the relationship between voltage trep tburst and frequency and show the range of possible parameter combinations that can be used in testing Each graph includes two voltage settings which are shown in different line thick nesses in relation to the trep values given for 20 10 5 2 1 0 5 0 2 and 0 1 ms The appropriate trep value bold trep for the bold line are labeled on the border of the graph Combinations of values that are below the line are allowed NSG 3040 EMC test system O O Wn n o N Lb ol o o Z F TT 2 H 7 HI 4 ff Ss i SS SN SSS SEEESEE ES Onn e Son e Advanced Test Solutions for EMC NOZ MO E ZH 5410612 000000 00000 0000 0001 00L TT RRE EES E m LOD 5 1 0 S Up Z 0 szo L Sen 56 0 51 z a gt g n t S Oo 5 sg n SG SOL SOL 00L soz soz 000 didHl E 0000
112. rings and plugs 5 status LEDs Universal power supply 85 265 V 50 60 Hz System master controller Single phase coupling network 270 V 16 A Fan with thermoregulated cooling controls LAN ETHERNET Interface Free WIN 3000 PC Software User manual S FTP interface cable NSG 3040 EMC test system Mains supply cable and EUT supply cable 99 Grounding strip 11 2 3 Combined wave surge module CWM 3450 CWM 3450 is a 4 4 kV Combined wave surge module and is compliant to EN IEC 61000 4 5 It comes fully programmed and tested A traceable calibration certificate is part of the delivery 11 2 4 Dips and drops module PQM 3403 PQM 3403 is a single phase 16 A dips and drops module and is compliant to EN IEC 61000 4 11 and 29 It comes fully programmed and tested A traceable calibration certificate is part of the delivery 11 2 5 Electrical fast transient burst module FTM 3425 FTM 3425 is a 4 8 kV fast transients burst pulse module and is compliant to EN IEC 61000 4 4 It comes fully programmed and tested A traceable calibration certificate is part of the delivery TASEO Advanced Test Solutions for EMC 100 11 3 NSG 3040 xxx ERC series ERC stands for Exclusive Remote Control Any model of NSG 3040 series can be delivered in ERC configuration These special versions are made for the users who want to drive the instru ments exclusively with a PC using WIN 3000 software In this case they might
113. rovides the actual path for the packet in and out of the gateway The gateway address is usually set at 0 0 0 0 Touch the Gateway button to enter the gateway address A red frame will be displayed around the field Enter the gateway address using the wheel or keypad Port Network ports can be either physical or virtual connection points The NSG 3040 has a physical Ethernet port that allows it to be connected to a PC or router The port address for the NSG 3040 should be set to 1025 Touch the Port button to enter the port number A red frame will be displayed around the field Enter the port number using the wheel or keypad MAC address Media Access Control MAC technology provides a unique identification and access control for devices on an IP network This address can not be changed Media Access Control assigns a unique number the MAC address to each network adapter The MAC address for the NSG 3040 network interface card displayed in the communication screen is unique to that card and cannot be changed NSG 3040 EMC test system 7 6 Monitoring Monitoring EUT Supply Variac Voltage NA EUT Power IN NA EUT Supply Frequency Test Action P at EUT Fail Input CEES NA Monitoring window Touch the Monitoring button to view EUT power input parameters and to control test activity and EUT power input in the event of EUT failure 7 6 1 EUT supply voltage EUT supply frequency The EUT supply voltage
114. rvention Ex Interlock is activated emergency button is pressed overtemperature for MFO 6502 ERROR LED on Problem which needs module repair please contact your nearest Teseq customer support center or sales representative Installation connection to NSG 3040 The equipment should be switched off during installa gt tion and interconnection Verify the setting of input voltage selector and adjust it to the right mains voltage value if required Connect instrument power from the mains Remove 25 way Sub D plug at rear of NSG 3040 Connect this connector to X2 of INA 6502 Connect master controller 25 way output to INA 6502 X1 plug using system interface cable delivered with INA 6502 Connect INA 6502 EUT power out to NSG 3040 EUT power input Connect INA 6502 EUT power in to mains using EUT power in cable delivered with NSG 3040 TASEO Advanced Test Solutions for EMC 131 132 Because of the capacitors in the internal coupler of NSG 3040 earth leakage currents of up to 4 A can occur in the EUT power supply network The test system must therefore be correctly earthed and be powered from a supply that is not protected by a residual current detec tor RCD Switch on INA 6502 first Switch on the NSG 3040 Switch on EUT power red switch when power for the EUT is required HW Detection The INA 6502 is automatically detected by the NSG 3040 during the booting process Its presence is v
115. ses IEC SOHZ CLASS 2 DIPS OPC 1 CYCLE 0 315 45 1cycle 3 pulses IEC 60HZ CLASS 2 DIPS OPC 1 CYCLE IEC 50HZ CLASS 2 DIPS 70PC 25 CYCLE IEC 60HZ CLASS 2 DIPS 70PC 30 CYCLE 0 315 45 0 315 45 105 0 315 45 1cycle 3 pulses 25 cycle 3 pulses 30 cycle 3 pulses IEC 50HZ CLASS 3 DIPS OPC 0 5 CYCLE 0 315 45 10 ms _ 3 pulses IEC 60HZ CLASS 3 DIPS OPC 0 5 CYCLE IEC SOHZ CLASS 3 DIPS OPC 1 CYCLE IEC 60HZ CLASS 3 DIPS OPC 1 CYCLE 0 315 45 0 3157 45 105 0 315 45 8333 us 3 pulses 1cycle 3 pulses 1cycle 3 pulses IEC SOHZ CLASS 3 DIPS 40PC 10 CYCLE 0 315 45 10 cycle 3 pulses IEC 60HZ CLASS 3 DIPS 40PC 12 CYCLE 0 315 45 12 cycle 3 pulses IEC SOHZ CLASS 3 DIPS 70PC 25 CYCLE 0 315 45 25 cycle 3 pulses IEC 60HZ CLASS 3 DIPS 70PC 30 CYCLE IEC 50HZ CLASS 3 DIPS 80PC 250 CYCLE IEC 60HZ CLASS 3 DIPS 80PC 300 CYCLE 0 315 45 0 315 45 10s 0 315 45 30 cycle 3 pulses 250 cycle 3 pulses 300 cycle 3 pulses IEC 50HZ CLASS 2 S INT OPC 250CY CLE 250 cycle 3 pulses IEC 60HZ CLASS 2 S INT OPC 300CYCLE v 10s 300 cycle 3 pulses IEC 50HZ CLASS 3 S INT OPC 250CY CLE 0 10s 250 cycle 3 pulses IEC 60HZ CLASS 3 S INT OPC 300CYCLE o 10s 300 cycle 3 pulses RE KORA KO ee File name implemented IEC DCV DIPS 101 5 4
116. shows the test parameter window for burst tests While the input fields differ for each type of test the red side bar and bottom bar remain the same Burst window ANSI coupling E Volt Pos 200 V Burst Time il IE EUT OFF i Frequency 100 Hz e ms test II TE EE ad a EE Duration JE Z P Bottom bar es D EH Example of the burst test window showing the red bar and bottom bar Red bar 8 1 The red menu bar EXIT Touch the Exit button to return to the system window without saving set tings NSG 3040 EMC test system EUT OFF EUT ON Touch the EUT Off EUT On button to switch EUT power off or on Note the EUT power function can work only in combination with an automated accessory such as a variac step transformer or automated CDN RAMP VALUE The Ramp value button is active only if a rampable parameter in the test window is selected All rampable parameters are identified by a small gray ramp icon This icon will turn red when a parameter is ramped Voltage Ramping Ramping Static Step Delay 1 s Start 200 V Stop Step al M S lt lt Ramping window for voltage parameter H Ramping mode Touch the Ramping mode button Static in the example to change the ramping mode from static to linear In linear mode the user can set Start Stop and Step values H Start Touch the Start button 200 V in the example A red frame
117. st EFT It includes a single phase 16 ACDN and the Teseq Standard User interface SUI featuring 7 2 colour touch display start pause and stop buttons and scalable rotary encoder NSG 3040 11 2 NSG 3040 a la carte The model presented above is available in any configuration maintaining the fact that the mainframe is prepared for easy fit plug and play of any module allowing easy upgrade Upgrade is then able to be done by the end user TASEO Advanced Test Solutions for EMC 98 11 2 1 Mainframe NSG 3040 MF NSG 3040 MF is wired configured and tested for easy integration of all pulse modules It includes following parts 19 EMC Housing with front rear panels internal mechanics wirings and plugs 7 2 color display Touch panel Rotary encoder Large Start Stop and pause buttons 5 status LEDs Universal power supply 85 265 V 50 60 Hz System master controller Single phase coupling network 270 V 16 A Fan with thermoregulated cooling controls LAN ETHERNET Interface Free WIN 3000 PC Software User manual S FTP interface cable Mains supply cable and EUT supply cable Grounding strip 11 2 2 Mainframe for exclusive remote control NSG 3040 MF ERC ERC stands for exclusive remote control NSG 3040 MF ERC is similar to NSG 3040 MF but without user interface It includes following parts 19 EMC Housing with front rear panels internal mechanics wi
118. sure optimal user and equipment safety only industry standard and 11 correctly specified plugs and sockets are used throughout TASEO Advanced Test Solutions for EMC 12 3 STANDARDS AND APPLICATIONS H The NSG 3040 test system is designed primarily for cable borne transient inter ference tests as specified in the European generic standards IEC EN 61000 6 1 covering equipment for household office and light industrial use and IEC EN 61000 6 2 for applications in industrial environments The NSG 3040 generates these tests in accordance with IEC EN 61000 4 2 4 5 11 and 29 Accessories are available for generating optional tests to IEC EN 61000 4 8 and 9 The EU directive No 2004 108 EEC for the assignment of the CE symbol refers to these standards and to this type of equipment 3 1 ESD test ESD tests in accordance with IEC EN 61000 4 2 must be performed with a separate ESD simulator such as the Teseq NSG 435 NSG 437 or NSG 438 The standard calls for both air and contact discharges and the simulator is sup plied with special tips for each type of test In the case of air discharges the simulator is discharged by holding the tip close to the Equipment Under Test EUT Then while depressing the trigger moving it closer to the target area until a discharge occurs Contact discharges occur with the tip of the simulator in direct contact with EUT 3 2 Burst test Burst tests in compliance with IEC EN 61000 4 4 s
119. surge generator NSG 3040 EMC test system The INA 702 is a 1 x 1 m loop 11 turns coil factor 9 8 when fitted with the power plug It enables the generation of field strengths of up to 40 A m for mains frequency fields 50 or 60 Hz when used with the MFO 6501 or MFO 6502 current sources INA 702 becomes a single turn loop when fitted with the pulse plug which allows the generation of pulsed field strengths up to 1200 A m where the current is generated by a 4400 V surge generator The INA 703 is the top end of a family of magnetic field coils designed for test ing to IEC 61000 4 8 supply frequency magnetic fields IEC 61000 4 9 pulsed magnetic fields and IEC 61000 4 10 oscillatory magnetic fields A multi turn concept 37 turns allows the INA 703 to generate fields higher than 1000 A m while using a programmable AC source rated for just 30 A This enables testing to the IEC 61000 4 8 standards requirement of a current THD lt 8 which can be met only with a programmable AC source The INA 703 has taps at turns 1 and 5 providing increased accuracy when generating low amplitude fields The tap off after 1 turn is also used for testing to IEC 61000 4 9 and IEC 61000 4 10 which both require a single turn coil TASEO Advanced Test Solutions for EMC 135 136 For testing to IEC 61000 4 8 the INA 703 can be used as an accessory to a Teseq Profline system comprising an NSG 1007 5 kVA source an INA 214
120. t L3 60 s 70 pulse TEC 3PH POWER LINES LX LX LEVEL 4 1 6 4000 V 0 270790 _ LT gt N 60 s 70 pulse 2 6 4000 V 27 0 D gt N 60s 70 pulse 36 4000 V 0 270790 DG gt N 60s 70 pulse 4 6 4000 V O 270790 L1 gt L2 60s 10 pulse 56 4000 V 0 270790 __ L1 gt L3 60 s 10 pulse 66 4000 V 27 L2 gt L3 60 s 10 pulse TEC 3PH POWER LINES LX PE LEVEL 1 1 4 500 V 12 O 270790 L1 gt PE 60s 70 pulse 2 4 500 V 12 0 270790 2 gt PE 60s 70 pulse 3 4 500V 12 0270780 L3 gt PE 60s 70 pulse 20 500 V 12 O 270790 N gt PE 60s 70 pulse TEC 3PH POWER LINES LX PE LEVEL 2 1 4 1000 V 12 27 0 L1 gt PE 60s 10 pulse 2 4 1000 V 12 0 270790 L2 gt PE 60 s 10 pulse 3 4 1000 V 12 0 270790 L3 gt PE 60 s 10 pulse 20 1000 V 12 0 270790 _ N gt PE 60 s 10 pulse TEC 3PH POWER LINES LX PE LEVEL 3 1 4 2000 V 12 0 270790 1 gt PE 60 s 10 pulse 24 2000V 12 0270780 L2 gt PE 60s 10 pulse 34 2000V 12 0 270790 L3 gt PE 60 s 10 pulse 44 2000 V 12 0270780 N gt PE 60s 70 pulse TEC 3PH POWER LINES LX PE LEVEL 4 1 4 4000 V 12 0 270790 L1 gt PE 60s 70 pulse 24 4000 V 12 O 270790 L2 gt PE 60s 70 pulse 34 4000 V 12 O 270790 L3 gt PE 60s 70 pulse 44 4000 V 12 0 270790 _ N gt PE 60s 70 pulse IEC DC LINES L N LEVEL 1 1 1 500 V 2 Asynch IT gt N 60 s 10 pulse TEC DC LINES L N LEVEL 2 1 2 500 V 2 Asynch it gt N 60 s 10 pulse 2 2
121. talla gt tion and interconnection Connect MFO 6501 to INA 701 702 or 703 loop In case of use of INA 702 insure that power plug is fitted Connect MFO 6501 to mains Connect external amp meter Switch on mains power Adjust the required current through the loop using the knob TASEO Advanced Test Solutions for EMC 140 Oz Operation adjustments The field generated in the loop antenna is directly proportional to the current flowing through it Field strength A m H Cf x Where H is the generated field Cf the coil factor the current flowing through the loop Please refer to following table for test level adjustment Standart level Field in Current re Current required Current re the loop quired for INA for INA 702 quired for INA A m 701 Cf 0 89 power Cf 9 8 703 Cf 34 1 1 1 12 0 102 0 029 2 3 3 37 0 306 0 088 3 10 A 1 02 0 294 4 30 A 3 06 0 882 D A0 A 4 08 1 176 X 120 A N A 3 53 Use the external amp meter to adjust the required current NSG 3040 EMC test system 14 4 2 Automatic solution MFO 6502 The automatic current generator type MFO 6502 magnetic field option is a standard accessory for the NSG 3040 series It provides a convenient means of generating and regulating the current to flow through one of the magnetic field loops INA 701 INA 702 Or INA 703 It is required for magnetic field test ing for fields up to 40 A m It co
122. ters as the dongle is the NSG 3000 instrument itself 14 2 Coupling decoupling networks for multiple phases higher currents and voltages To allow testing of equipment rated for multiple phases a wide range of vari ous coupling decoupling networks is available in various configurations The CDN 3043 and 3063 series are available in various configurations and for various EUT currents and voltages These CDN series are full automatic control featuring plug and play technol ogy just connect to NSG 3040 they will autodetect and autoconfigure at system power up available coupling possibilities will show up in respective test windows TASEO Advanced Test Solutions for EMC 110 All CDN 3043 and 3063 series feature Manual and programmable control of EUT power ON OFF Input phase rotation detection Thermal monitoring of internal backfilter chokes in case the EUT current goes up the integrated fans which are silent at standby and at low EUT currents will speed up to improve cooling D In case of intentional or unintentional overloading the CDN 3043 and 3063 series will automatically switch off EUT power in order to protect itself risk of fire 14 2 1 CDN 3043 16 A and 32 A series Technical specifications Voltage ratings 280 VAC phase to neutral or phase to ground 480 VAC phase s to phase s 125 VDC full current range 225 VDC for max 7 A NSG 3040 EMC test system Not
123. ting temperature Overload protection Weight Dimensions Control cable Value lt 8 nominal lt 3 5 at full range Selectable 50 and 60 Hz 3 Software driven 80 to 400 mA into INA 702 Cf 9 8 gt allows 0 8 to 4 A m 80 to 440 mA into INA 701 Cf 0 89 gt allows 0 08 to 0 4 A m INTO INA 703 200 mA to 4 1 A into INA 702 Cf 9 8 gt allows 2 40 A m 200 mA to 4 1 A Into INA 701 Cf 0 89 gt allows 0 2 3 6 A m 90 to 240 V lt 150W 5 40 C By temperature sensor on power stage 4 2 kg approx 195 x 180 x 380 mm 2 meter 25 way sub D twisted pair shielded incl in delivery Typical for the full range from standard level 1 lowest standard level to full range level X Current adjustment through customer provided amp meter NSG 3040 EMC test system peratures below 30 C For higher environment tem peratures internal temperature sensor might trip after a few minutes Indicated max values reachable for environmental tem 145 Power LED green shows if instrument is powered up Error LED red ERROR LED off No problem accessory is ready to run ERROR LED blinking Problem able to be solved by user Ex Interlock is activated emergency button is pressed overtemperature ERROR LED on Problem which needs module repair please contact your nearest Teseq customer support center or sales representative The equipment should be switched off d
124. uality connectors ensure user safety additional system protection is provided by a temperature sensor located on the heatsink of the power amplifier MFO 6501 is designed to drive INDUCTIVE LOADS ONLY E as magnetic field loops H Connecting capacitive loads will destroy the Instrument Circuit diagram MFO 6501 Mains Power supply a input 15V 0V 15V Black Power amplifier LL O Signal generator KU XN j N 50 HZ Amplitude Low 60 Hz setting High NSG 3040 EMC test system Technical specifications MFO 6501 139 Parameter Value Total harmonic distortion THD lt 8 nominal lt 3 5 at full range Frequency Selectable 50 and 60 Hz 3 Range low 80 to 400 mA into INA 702 Cf 9 8 gt allows 0 8 to 4 A m 80 to 440 mA into INA 701 Cf 0 89 gt allows 0 08 to 0 4 A m INTO INA 703 Range high 200 mA to 4 1 A into INA 702 Cf 9 8 gt allows 2 40 A m 200 mA to 4 1 A Into INA 701 Cf 0 89 gt allows 0 2 3 6 A m Supply voltage 90 to 240 V Power consumption lt 150 W Operating temperature 5 40 C Overload protection By temperature sensor on power stage Weight 4 kg approx Dimensions 195 x 180 x 380 mm Typical for the full range from standard level 1 lowest standard level to full range level X Current adjustment through customer provided amp meter Installation The equipment should be switched off during ins
125. ulse ANSI 3 PH BASIC 2 CAT A3 6000 V 0 270 90 L2 gt L1 20 s 10 pulse ANSI 3 PH BASIC 3 CAT A1 2000V 0 270 90 L3 gt L2 10s 10 pulse ANSI 3 PH BASIC 3 CAT A2 4000 V 0 270 90 L3 gt L2 20 s 10 pulse ANSI 3 PH BASIC 3 CAT A3 6000 V 0 270 90 L3 gt L2 20 s 10 pulse ANSI 3 PH BASIC 4 CAT A1 2000V 0 270 90 L1 gt L3 10s 10 pulse ANSI 3 PH BASIC 4 CAT A2 4000 V 0 270 90 L1 gt L3 20s 10 pulse ANSI 3 PH BASIC 4 CAT A3 6000 V 0 270 90 L1 gt L3 20s 10 pulse NSG 3040 EMC test system O 9 DES CRIPTION OF THE 25 PIN D SUB SIGNALS Good EMC engineering practises should be applied when connecting signals to this port As the whole system generates disturbances in order to avoid auto disturbing all wires connected to this port should be properly shielded the shield of the cable not serving as signal return path the shield to be connected via a large surface to the conductive shell of the Sub D plug 9 1 Interlock Between Pin 5 hi and Pin 2 8 15 20 low This connection is an integral part of the interlock safety circuit If a number of units are incorporated in a system then these connections can be daisy chained together to form a single safety circuit If no external interlock circuit is required then the shorting connection must be made by using the terminator connector s ited upplied Otherwise pulse generation in the system will be
126. ulse cali bration safe and reliable connection to measuring probes Max applicable surge voltage is 10 kV Can also be used to build injection probe to couple surge pulses to shielded datalines and EUT s housings etc INA 3233 Adapter IEC 320 to banana plugs To former INA 6554 connect EUT with banana plugs to NSG 3040 or CDN 3061 series 14 8 2 Test adapters INA 3230 Adapter IEC 320 to Schuko plug To former INA 6550 connect EUT with Schuko plugs to NSG 3040 or CDN 3061 series former INA 6551 nect EUT with Swiss plug to NSG 3040 or CDN 3061 series S INA 3231 Adapter IEC 320 to Swiss plug To con NSG 3040 EMC test system INA 3232 Adapter IEC 320 to French plug To 161 former INA 6555 connect EUT with French plugs to NSG 3040 or CDN 3061 series 14 8 3 Various cables and plugs INA 6542 EUT power IN cable for NSG 3000 series and accessories INA 6543 Mains plug adapter for EUT connec tion to NSG 3040 and CDN 3061 series INA 6544 HV plug set Surge out for NSG 3000 series for cable diameter 10 3 mm Can be used for connection to exter nal CDN or to make an injection probe to couple surge pulses to shielded datalines and EUT s housings TASEO Advanced Test Solutions for EMC 162 INA 6545 INA 6546 O INA 6547 O INA 6548 Q INA 6556 NSG 3040 EMC test system HV plug set surge out for NSG 3000 series for cable diameter 5 1 mm Can be used for connection to external
127. uring a running test When the button is set to Off parameters can be changed only when the NSG 3040 is in stop mode Expert mode is only available for burst pulses FFT Voltage Uin This button is active only when an optional automated VAR 6502 or VAR 3005 variac is connected to the NSG 3040 The value entered in this field is the voltage measured at the mains socket and is used as the 100 reference point for voltage variation tests Touch the voltage Uin button 230 in the example Use the wheel or keypad to set the input voltage Uin setting will be saved and is valid for all following tests Uin are changeable via WIN 3000 dialoge to be used in sequence mode TASEO Advanced Test Solutions for EMC 37 38 7 4 Equipment Equipment detail SUI 3000 080313 NA NA NA NA MODMC_MU 0001 23A 357 4 5 2007 4 5 2007 V Bayer HYS6601 0001 14g 1 1 1 2003 11 2003 V Bayer EFT6601 0001 14g 14 1 41 2003 1 1 2003 V Bayer RW6601 0001 14k 000000 1 1 2003 1 1 2003 V Bayer Equipment window Touch the Equipment button to access a list of all internal and external genera tor modules including firmware versions serial numbers calibration dates and certificate numbers The red vertical bar on the right of the equipment window displays three buttons Exit Up and Down EXIT Touch the Exit button to return to the system window UP DOWN If the system includes more than 5 modules touch the
128. uring installa tion and interconnection Installation connection to NSG 3040 m Connect instrument power in to mains m Remome 25 way Sub D plug at rear of NSG 3040 m Connect this connector to X2 of MFO 6502 D Connect NSG 3040 25 way output to MFO 6502 X1 plug using system interface cable delivered with MFO 6502 m Connect MFO 6502 to loop antenna INA 701 702 or 703 m In case of INA 702 verify that Power plug is fitted to the coil inter face unit a Power on MFO 6502 P Power on NSG 3040 main frame Operation The coil factor is given by the loop antenna manufacturer For Teseq INA 701 702 and INA 703 loop antennas this factor is labelled on the antenna and is also indicated in the test report delivered with it TASEO Advanced Test Solutions for EMC 146 Power Line Magnetic Field test Field Coil Strenght Alm Factor el 7 Frequency sonz poration 10 S v es 14 5 Pulse wave shape adapter INA 752 The pulse waveshape adapter INA 752 is a standard accessory for the Teseq NSG 3000 series It provides a convenient means for interconnecting the NSG 3040 surge generator with the loop antennas INA 701 702 or 703 and insures that the generated pulsed magnetic field has the waveshape as specified in the application standard The combination NSG 3040 with CWM 3450 INA 752 INA 701 or 702 or 703 is required for magnetic field testing for pulsed fields up to 1200 A m It complies to the
129. us system The standard user interface SUI ain menu System window General settings Equipment Communication onitoring EUT supply voltage EUT supply frequency Test action at EUT fail input EUT power supply by EUT fail input Exit EUT on Ok SD card properties Viewing the current SUI version Updating SUI software via the SD card Language Setting test parameters The red menu bar The bottom bar Load user test Load standard test Save test Burst generator setting Test configuration with power line coupling 26 26 26 27 27 28 30 30 30 31 33 34 35 35 38 38 41 41 41 42 42 42 42 42 43 44 47 48 48 52 52 54 56 58 59 8 3 2 8 3 3 8 3 4 8 3 5 8 3 6 8 3 7 8 3 8 8 3 9 8 3 10 8 3 11 8 3 12 8 4 8 4 1 8 4 2 8 4 3 8 4 4 8 4 5 8 4 6 8 4 7 8 4 8 8 4 9 8 5 8 5 1 8 5 2 8 5 3 8 5 4 8 5 5 8 5 6 8 5 7 8 5 8 8 6 8 7 8 8 8 9 Test configuration with external coupling Burst parameters window Voltage Frequency Phase Coupling Burst time Repetition time Test duration Burst generator technical data Derating Combination wave Surge parameter setting Test configuration for power line coupling Test configuration for external coupling Voltage Impedance Phase Coupling Repetition time Test duration Surge generator technical data Dips drops and variantions Examples of dips drops Dips and drops generator Voltage U Var Phase Repetition tim
130. verification of the test equipment before and after every test session If the verification shows differing results no valid test results can be assumed and the test equipment has to be re calibrated t is therefore highly recommended that the EMC test engineer periodically verifies his test equipment in order to ensure good functionality and accuracy Periodic verification can be done before a test session or once a day or week or month it is up to the user to decide Only a few points need to be checked which will take only a few minutes if the right test equipment is available Potential free differential measurements Since it may be useful to measure pulses superimposed on the mains for pe riodic verification purposes it is essential to work with differential measure ments Using classic non differential probes and connecting with reversed polarity will result in the oscilloscope chassis being connected to the mains In the best case a circuit breaker will trip in the worst case for example if the oscilloscope is battery powered or supplied via an isolation transformer the oscilloscope chassis will be at a voltage equal to mains voltage plus the peak pulse voltage which could be lethal for the user The Teseq high voltage differential probe MD 200 serie is ideally suited to measure all kinds of EMI pulses in the microsecond range industrial telecom and automotive surges as well as power line dips dropouts and distortions N
131. voltage 200 to 4400V 10 s repetition time 4401 to 6600V 20 s repetition time 8 5 Dips drops and vaiations Dips drops and variaton tests are in line with the specifications of IEC 61000 4 11 The EUT suppy voltage Input La gets switched off shortly via a semiconduc tor switch in order to generate short supply dropouts A second switch is available in the generator with a sceond input channel In put Lb where a variable supply can be connected This second switch works in opposition with the first one so always one of the 2 switches is closed when the other one is open Generally a step transformer or a variac is used as second supply powered by the same supply then Input La in order to have phase synchronisation of the 2 input sources This setup allows dips which are short voltage variantions from one supply voltage level provided through generator Input La to another voltage level provided through generator In put LD EUTs with universal supply voltage ranges ex 85 to 245 VAC need to be tested for both extremes of supply For this application Teseq offers a double variac VAR 3005 which allows to provide the variable voltage required for EUT powering as well as the variable voltage of the dip these in one box and powered from one mains The use of a motorised variac as VAR 3005 also allows to run variation tests which are slower changes in EUT supply voltage Using DC supplies instead of AC su
132. y only be opened by a qualified specialist upon specific instruction given by the manufacturer Since the instrument works on prin ciple with two independent power supplies one for the generator and one for the EUT the NSG 3040 must be disconnected from both sources before any modifications to the test setup are undertaken Besides the mains connections themselves certain components also operate at high voltages and are not provided with any form of extra protection against accidental contact 4 3 Installation of an EUT power switch The EUT input should be connected through a properly rated power switch device which should be located close to the test setup In order to ensure easy and quick access to the EUT power the switch should be clearly and visibly labeled as EUT power ON OFF The in house power distribution must be equipped with a proper circuit breaker and an emergency off button as per IEC 61010 1 2001 The test setup should only be accessible to trained per H sonnel Dimensioning of the mains supply and rating of fuse protection of the AC or DC power supply must conform with local electrical codes and EUT requirements Inappropriate arrangement mounting cabling or handling of the EUT or ground can hamper or negate the effectiveness of the NSG 3040 s safety features 4 4 Applicable safety standards Development and manufacture is in compliance with ISO 9001 The system complies with the safety requirements
133. y tests Operation via touch screen or software wise via a PC ink Ethernet TCP IP interface Pulse output to external coupling networks Housing for bench top or rack use Bench top housing made of metal with moulded plastic front panel Supplementary rack mounting kit On off switch on rear panel of the instrument Power on LED yellow Pulse LED green High voltage active LED red EUT Power on LED green Error LED red Main fuses interlock EUT fail input 5 to 40 C 20 to 80 relative humidity non con densing 68 106 kPa atmospheric pressure Routines for functional self test IEC 61010 1 safety requirements for electrical equip ment used for measurement and control purpose as well as laboratory use NSG 3040 EMC test system NOTES Ad TASEO vanced Test Solutions for EMC 165 Headquarters Teseq AG 4542 Luterbach Switzerland T 41 32 681 40 40 F 41 32 681 40 48 sales teseq com www teseq com China Teseq Company Limited T 86 10 8460 8080 F 86 10 8460 8078 chinasales Qteseq com Germany Teseq GmbH T 49 30 5659 8835 F 49 30 5659 8834 desales teseq com Singapore Teseq Pte Ltd T 65 6846 2488 F 65 6841 4282 singaporesales Qteseq com Taiwan Teseq Ltd T 886 2 2917 8080 F 886 2 2917 2626 taiwansales Q teseq com USA Teseq Inc T 1 732 417 0501 F 1 732 417 0511 Toll free 1 888 417 0501 usasales Q teseq com

601-279D - NSG 3040 User Manual english.indd

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