data Sheet
Contents
1. 2510 2510 AT 2510 AT AUTOTUNING TEC Si ex enten 4 Lake Ordering Information 2510 TEC SourceMeter 2510 AT Autotuning TEC SourceMeter Instrument Accessories Supplied User s Manual Input Output Connector ACCESSORIES AVAILABLE 2510 RH Resistive Heater Adapter for Model 2510 2510 CAB 4 Wire Unshielded Cable Phoenix Connector to Unterminated End 7007 1 Shielded IEEE 488 Cable 1m 3 3 ft 7007 2 Shielded IEEE 488 Cable 2m 6 6 ft KPCI 488LPA IEEE 488 Interface Controller for the PCI Bus KUSB 488B IEEE 488 USB to GPIB Adapter for USB Port SERVICES AVAILABLE 2510 3Y EW 1 year factory warranty extended to 3 years from date of shipment 2510 AT 3Y EW 1 year factory warranty extended to 3 years from date of shipment C 2510 3Y DATA 3 Z540 1 compliant calibrations within 3 years of purchase for Models 2510 2510 AT Not available in all countries 1 888 KEITHLEY us only TEC SourceMeter Instrument Autotuning TEC SourceMeter Instrument The Models 2510 and 2510 AT TEC SourceMeter instruments enhance Keithley s CW Continuous Wave test solution for high speed LIV light current voltage testing of laser diode modules These 50W bipolar instruments were developed in close cooperation with leading manufacturers of laser diode modules for fiberoptic telecom munications networks Designed to ensure tight temperature control for the device under test the Model 2510 was the first in a line of highly spe2. A GREATER MEASURE OF CONFIDENCE
3. Nominal Thermistor Accuracy vs Temperature Resistance 0 C 25 C 50 C 100 C 100 Q 0 021 C 0 035 C 0 070 C 0 27 C 1 kQ 0 015 C 0 023 C 0 045 C 0 18 C 10 kQ 0 006 C 0 012 C 0 026 C 0 15 C 100 kQ 0 009 C 0 014 C 0 026 C 0 13 C OPEN SHORTED ELEMENT DETECTION SOFTWARE LINEARIZATION FOR THERMISTOR AND RTD Common Mode Voltage 30VDC Common Mode Isolation gt 10 lt 1000pF Max Voltage Drop Between Input Output Sense Terminals 1V Max Sense Lead Resistance 100Q for rated accuracy Sense Input Impedance gt 10 Q 1 888 KEITHLEY us only www keithley com NOISE REJECTION SPEED NPLC Normal 1 00 CMRR 120 dB NMRR 60 dB SOURCE OUTPUT MODES Fixed DC level PROGRAMMABILITY IEEE 488 SCPI 1995 0 RS 232 3 user definable power up states plus factory default and RST POWER SUPPLY 90V to 260V rms 50 60Hz 75W EMC Complies with European Union Directive 98 336 EEC CE marking requirements FCC part 15 class B CTSPR 11 IEC 801 2 IEC 801 3 IEC 801 4 VIBRATION MIL PRF 28800F Class 3 Random Vibration WARM UP 1 hour to rated accuracies DIMENSIONS WEIGHT 89mm high x 213 mm high x 370mm deep 3 in x 8 in X 146 in Bench configu ration with handle and feet 104mm high x 238mm wide x 370mm deep 4 in X 9 in X 14 in Net Weight 3 21kg 7 08 Ibs ENVIRONMENT Operating 0 50 C 70 R H up to 35 C Derate 3 R H C 35 50 C Stor
4. 2 0 of rdg 0 12 Operating Voltage 0 1 of rdg 4mV Operating Current 0 4 of rdg 8mA AC Resistance 2 18 0 10 of rdg 0 02Q OPEN SHORTED THERMOELECTRIC DETECTION LOAD IMPEDANCE Stable into 1uF typical COMMON MODE VOLTAGE 30VDC maximum COMMON MODE ISOLATION gt 10 Q lt 1500pF MAX VOLTAGE DROP BETWEEN INPUT OUTPUT SENSE TERMINALS 1V MAX SENSE LEAD RESISTANCE 1Q for rated accuracy MAX FORCE LEAD RESISTANCE 0 19 SENSE INPUT IMPEDANCE gt 400kQ THERMAL FEEDBACK ELEMENT SPECIFICATIONS Sensor Type RTD Thermistor Solid State Current Voltage 100 Q 1ko 100 Q 1ko 10 kQ 100 kQ Output 1 Output V ii 2 5 mA 2 5 mA 833 uA 100 uA 33 uA 13 5V 2 5 mA 13 pane 4V max 833 HA 8 V max 8 V max 8 V max 6 6 V max 833 uA 15 75V max Nominal Resistance Range 0 250 Q 0 2 50 kQ 0 1 kQ 0 10 kQ 0 80 kQ 0 200 kQ Excitation Accuracy 1 5 2 9 2 9 2 9 2 9 29 12 29 Nominal Sensor 50 to 250 C 50 to 250 C 50 to 250 C 50 to 250 C 50 to 250 C 50 to 250 C 40 to 100 c 40 to 100 C Temperature Range Calibration a B settable B amp settable A B C settable A B C settable A B C settable A B C settable Slope amp offset Slope amp offset Measurement Accuracy a al 3 3 rdg offset 0 04 0 07 Q 0 04 0 04 Q 0 04 0 07 Q 0 04 0 4 Q 0 02 3 Q 0 04 210 0 03 100 nA 0 03 500 uV THERMISTOR MEASUREMENT ACCURACY GENERAL NOTES
5. sensors Maintains constant temperature current voltage and sensor resistance AC Ohms measurement function verifies integrity of TEC Measures and displays TEC parameters during the control cycle 4 wire open short lead detection for thermal feedback element IEEE 488 and RS 232 interfaces Compact half rack design APPLICATIONS Control and production testing of thermoelectric coolers Peltier devices in e Laser diode modules IR charge coupled device CCD arrays and charge injection devices CID Cooled photodetectors e Thermal optic switches e Temperature controlled fixtures 1 888 KEITHLEY us only TEC SourceMeter Instrument Autotuning TEC SourceMeter Instrument Tstart Active temperature control is very important due to the sensitivity of laser diodes to temperature changes If the temperature var ies the laser diode s dominant output wavelength may change leading to signal overlap and crosstalk problems Autotuning Function Figure 2 Laser Diode TEC Minimum Overshoot Time s Figure 3 Laser Diode TEC Minimum Settling Time 10 15 20 Time s Figure 4 The Model 2510 AT Autotuning TEC SourceMeter instrument offers manufacturers the ability to automatically tune the tem perature control loop required for CW testing of optoelectronic components such as laser diode modules and thermo optic switches This capa bility elimi
6. 001 C Before the introduction of the Model 2510 AT configuring test systems for new module designs and fixtures required the user to determine the best combination of P I and D coefficients through trial and error experimenta tion The Model 2510 AT s autotuning function uses the modified Zeigler Nichols algorithm to determine the optimal P I and D values automatically Adaptable to Evolving DUT Requirements The Model 2510 and Model 2510 AT are well suited for testing a wide range of laser diode modules because they are compatible with the types of temperature sensors most commonly used in these modules In addition to 100Q 1kQ 10kQ and 100kQ thermistors they can handle inputs from 100Q or 1kQ RTDs and a variety of solid state temperature sensors This input flexibility ensures their adaptability as the modules being tested evolve over time Programmable Setpoints and Limits Users can assign temperature current voltage and thermistor resistance setpoints The thermistor resistance setpoint feature allows higher cor relation of test results with actual performance in the field for laser diode modules because reference resistors are used to control the temperature of the module Programmable power current and temperature limits offer maximum protection against damage to the device under test Accurate Real Time Measurements Both models can perform real time measurements on the TEC including TEC current voltage drop p
7. CS TEST wn i e Ez iS oO o na 7 er Te N S re N D gej e OPTOELECTRONICS TEST 2510 2510 AT SPECIFICATIONS The Models 2510 and 2510 AT TEC SourceMeter instruments are designed to Control the power to the TEC to maintain a constant temperature current voltage or thermis tor resistance Measure the resistance of the TEC e Provide greater control and flexibility through a software P I D loop CONTROL SYSTEM SPECIFICATIONS SET Constant Peltier Temperature Constant Peltier Voltage Constant Peltier Current Constant Thermistor Resistance CONTROL METHOD Programmable software PID loop Proportional Integral and Derivative gains independently programmable SETPOINT SHORT TERM STABILITY 0 005 C rms 67 SETPOINT LONG TERM STABILITY 0 01 C 58 SETPOINT RANGE 50 C to 225 C UPPER TEMPERATURE LIMIT 250 C max LOWER TEMPERATURE LIMIT 50 C max SETPOINT RESOLUTION 0 001 C lt 400uV lt 200yA 0 01 of nominal 25 C thermistor resistance HARDWARE CURRENT LIMIT 1 0A to 5 25A 5 SOFTWARE VOLTAGE LIMIT 0 5 to 10 5V 5 TEC SourceMeter Instrument Autotuning TEC SourceMeter Instrument TEC OUTPUT SPECIFICATIONS OUTPUT RANGE 10VDC at up to 5ADC OUTPUT RIPPLE lt 5mV rms AC RESISTANCE EXCITATION 9 6mA 904A TEC MEASUREMENT SPECIFICATIONS Function 1 Year 23 C 5 C Operating Resistance 1 11 12
8. age 25 to 65 C 1 Model 2510 and device under test in a regulated ambient temperature of 25 C 2 With remote voltage sense 3 Lyear 23 C 5 C With Loa 5A and Viona OV 5 With Iygaq 5A and Vya 10V 6 With 10kQ thermistor as sensor 7 Short term stability is defined as 24 hours with Peltier and Model 2510 at 25 C 0 5 C 8 Long term stability is defined as 30 days with Peltier and Model 2510 at 25 C 0 5 C 9 10Hz to 10MHz measured at 5A output into a 2Q load 10 Common mode voltage OV meter connect enabled connects Peltier low output to thermistor measure circuit ground 0 1 of rdg 0 1Q with meter connect disabled 11 Resistance range 0Q to 20Q for rated accuracy 12 Current through Peltier gt 0 2A 13 Default values shown selectable values of 3A 104A 334A 1004A 8334A 2 5mA Note that temperature control performance will degrade at lower currents 14 AC ohms is a dual pulsed measurement using current reversals avail able over bus only 15 Settable to lt 400uV and lt 200A in constant V and constant I mode respectively 16 For line frequency 0 1 17 For 1kQ unbalance in LO lead 18 Resistance range 0Q to 100Q for rated accuracy 19 Accuracy figures represent the uncertainty that the Model 2510 may add to the temperature measurement not including thermistor uncertainty These accuracy figures are for thermistors with typical A B C constants KEITHLEY
9. cialized instruments created for telecommu nications laser diode testing It brings together Keithley s expertise in high speed DC sourcing and measurement with the ability to control the operation of a laser diode module s Thermo Electric Cooler or TEC sometimes called a Peltier device accurately The Model 2510 AT expands the capability of the Model 2510 by offering autotuning capability P I and D proportional integral and derivative values for closed loop temperature control are deter mined by the instrument using a modified Zeigler Nichols algorithm This eliminates the need for users to determine the optimal values for these coefficients experimentally In all other respects the Model 2510 and Model 2510 AT provide exactly the same set of features and capabilities The SourceMeter Concept The Model 2510 and Model 2510 AT draw upon Keithley s unique SourceMeter concept which combines precision voltage current sourcing and measurement functions into a single instrument SourceMeter instruments provide numerous advantages over the use of separate instruments includ ing lower acquisition and maintenance costs the need for less rack space easier system integration and programming and a broad dynamic range Part of a Comprehensive LIV Test System In a laser diode CW test stand the Model 2510 or Model 2510 AT can control the temperature of actively cooled optical components and assemblies such as laser diode modules to
10. nates the need for time consuming experimentation to determine the optimal P I D coefficient values The Model 2510 AT s P I D Auto Tune software employs a modified Ziegler Nichols algorithm to determine the coefficients used to control the P I D loop This algorithm ensures that the final settling perturbations are damped by 25 each cycle of the oscillation The autotuning process begins with applying a voltage step input to the system being tuned in open loop mode and measuring several parameters of the system s response to this voltage step function The system s response to the step function is illus trated in Figure 2 The lag time of the system response the maximum initial slope and the TAU 63 1 e response time are measured then used to generate the Kp proportional gain constant Ki integral gain constant and Kd derivative gain constant coefficients The autotuning function offers users a choice of a minimum settling time mode or a minimum overshoot mode which provides the Model 2510 AT with the flexibility to be used with a variety of load types and devices For example when controlling a large area TEC in a test fix ture optimized for P I and D values minimum overshoot protects the devices in the fixture from damage Figure 3 For temperature setpoints that do not approach the maximum specified temperature for the device under test the minimum settling time mode can be used to speed up the autotuning f
11. ower dissipation and resistance providing valuable information on the operation of the thermal control system Peltier TEC Ohms Measurement TEC devices are easily affected by mechanical damage such as sheer stress during assembly The most effective method to test a device for damage after it has been incorporated into a laser diode module is to perform a low level AC or reversing DC ohms measurement If there is a change in the TEC s resistance value when compared with the manufacturer s speci fication mechanical damage is indicated Unlike a standard DC resistance measurement where the current passing through the device can produce device heating and affect the measured resistance the reversing DC ohms method does not and allows more accurate measurements 1 888 KEITHLEY us only www keithley com A TEC SourceMeter Instrument Autotuning TEC SourceMeter Instrument Open Short Lead Detection Both models of the instrument use a four wire measurement method to detect open short leads on the temperature sensor before testing Four wire measurements eliminate lead resistance errors on the measured value reducing the possibility of false failures or device damage Interface Options Like all newer Keithley instruments both models of the instrument include standard IEEE 488 and RS 232 interfaces to speed and simplify system inte gration and control Optional Resistive Heater Adapter The Model 2510 RH Resistive Heate
12. r Adapter enables either model of the instrument to provide closed loop temperature control for resistive heater elements rather than for TECs When the adapter is installed at the instrument s output terminal current flows through the resistive heater when the P I D loop indicates heating However no cur rent will flow to the resistive heater when the temperature loop calls for cooling The resistive element is cooled through radiation conduc Figure 6 Optional heater adapter tion or convection Comparison Data n 2510 Measured m Competitor Measured One Hour Interval Figure 5 This graph compares the Model 2510 2510 AT s A D con verter resolution and temperature stability with that of a leading com petitive instrument While the competitive instrument uses an analog proportional integral P I control loop it displays information in digital format through a low resolution analog to digital converter In contrast the Model 2510 2510 AT uses a high precision digital P I D control loop which provides greater temperature stability both over the short term 0 005 C and the long term 0 01 C KEITHLEY GREATER MEASURE OF COIN FI DEN CE ow VU z je 2 eb a O E D a jo Z je 2 a a ete 2 O Q z wn O Lu e je o je O o Z lt b a E v g 5 VU i g a OPTOELECTRONI
13. unction Figure 4 50W Output As the complexity of today s laser diode modules increases higher power levels are needed in temperature controllers to address the module s cooling needs during production test The 50W A GREATER MEASURE OF CONFIDENCE 2510 2510 AT 5A 10V output allows for higher testing speeds and a wider tempera ture setpoint range than other lower power solutions High Stability P I D Control When compared with other TEC controllers which use less sophisticated P I proportional integral loops and hardware control mechanisms this instrument s software based fully digital P I D control provides greater temperature stability and can be easily upgraded with a simple firm ware change The resulting temperature stability 0 005 C short term 0 01 C long term allows for very fine control over the output wavelength and optical power of the laser diode module during production testing of DC characteristics This improved stability gives users higher confi dence in measured values especially for components or sub assemblies in wavelength multiplexed networks The derivative component of the instrument s P I D control also reduces the required waiting time between making measurements at various temperature setpoints The temperature setpoint range of 50 C to 225 C covers most of the test requirements for production testing of cooled optical components and sub assemblies with a resolution of 0
14. within 0 005 C of the user defined setpoint During testing the instrument measures the internal temperature of the laser diode module from any of a variety of temperature sensors then drives power through the TEC within the laser diode module in order to maintain its temperature at the desired setpoint Figure 1 The capabilities of the Models 2510 and 2510 AT are intended to complement those of other Keithley instruments often used in laser diode module LIV testing including the Model 2400 and 2420 SourceMeter instruments the Model 2502 Dual Photo diode Meter and the Model 2500INT Integrating Sphere Trigger Link 2510 or 2510 AT MAS NAY Thermistor Peltier Vas ay Computer 2500INT 7a Lu 7a v zZ e U Lu Lu oe a e A GREATER MEASURE OF CONFIDENCE 2 Lud 7a U zZ e U Ww al Ww ie a e 2510 2510 AT 50W TEC Controller combined with DC measurement functions Fully digital P I D control Autotuning capability for the thermal control loop 2510 AT Designed to control temperature during laser diode module testing Wide temperature setpoint range 50 C to 225 C and high setpoint resolution 0 001 C and stability 0 005 C Compatible with a variety of temperature sensor inputs thermistors RTDs and IC
Download Pdf Manuals
Related Search