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        Laboratory Experiment 5 EE348L Spring 2005
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1.             Kok Ko Kk kk K KC KC CK Kk Ko Kk Kk Ko       Kk                                                     K KC       OKCk Kok KC       MASS do 6       XIQSCIIDELOS  6                 KO                                                        CK                                                                   KG BG XB XB         X X                                                                                                                                           mil drain gate source bulk nmos 2N7000   W 0    8E 2  L 2 5 6                                              Kk Ko                                           K                  Kk    Kk Kok            K KC                        ok                                                             K       CK          6 6           RA   SOUECOS Section                                                                                                                           9               9        9               2              ck k ok              ok ck ck ck                 Kk    ockock                         vdrain drain vss 5V      vsource source vss OV   vbulk bulk vss OV   vgate gate ves  LV   WZ VSS 0 OV                                                                                                            ok K Ko KC Kk Kk Ko Kk Kk KK         Kok Ko Kk                        KC                            K KC            OKCk Kok            specify nominal temperature of circuit in degrees C  KKEKKKKKKKKKKKKK
2.    LxZ0  mI  t    probe de OgLtotel   par  lx18  ml       probe dc vthreshold   par  lv9 ml       probe dc vdsat   par  lv10 ml1       probe dc gm   par  lx7 ml       probe dc gmbs   par  lx9 ml        Ppeobe de qds   qaa 1x8  21         probe  de  rds   par  1 1x8  m1                                                                                           S S                KK         KK                                          M KA                            SK           CK CK                CK CK Ck                 OCC     xxx x models section      OCA OK KOC CK Ck Ck Ck Kk CK CK CK SK SKK           AAA AAA X                       RARA RA                              AAA                                A Webs  Model  S Trom Supettexcom     MODEL nmos 2N7000 NMOS    LEVEL 3 RS 0 205 NSUB 1 0E15   TDELTA O  KAPPA 0 0506 TPG 1 GGDO S  TL J165 9  TRDe05 239 1710 1   0 VMAX 1   7 ETA 0 0223089   NFS 6 6E10 TOX 1 0BE   LD 1 698E 9 UO 862 425   XJ 6 4666E 7 TAR A   4 085 C6GSO 9 09E 9     END    Figure 5 14  HSpice netlist for obtaining l V characteristic of an n channel MOSFET  2N7000     EE348L  Spring 2005    B  Madhavan   22 of 29     350m    200m    200m    100m       Voltage X  lin   VOLTS     Figure 5 15  ip Vps characteristics of MOSFET m1 in Figure 5 14 for gate to source voltages of 2  3  and 4 volts     Plots of the transconductance  Qm  of the MOSFET m1 in the netlist in Figure 5 14 for gate to  source voltages of 2V  3V  and 4V are shown in Figure 5 16     260m  240m
3.   220m  200m  180m  160m  140m    120m       0 1 2 3 4    Voltage X  lin   VOLTS     Figure 5 16  g   versus             characteristics of MOSFET m1 in Figure 5 14 for gate to source voltages of 2  3  and 4 volts     B  Madhavan Page 23 of 29 EE348L  Spring 2005    5 10 Conclusion    MOSFETs are the most commonly used semiconductor today in integrated circuit design  A  circuit designer must bias the MOSFET correctly to ensure small signal linear operation  If not  biased properly  distortion will hinder the design  The next lab will assume that the MOSFET is  biased in the saturation region and deal primarily with dynamic operation and the small signal  model     The MOSFET canonic cells behave very analogous to the BJT canonic cells  The absolute  values and expressions found for the gain  input resistance  and output resistance may differ  but  the point is the canonic cells of both technologies have remarkably close behavior  However   don t fall in the trap of just replacing MOSFET with BJT  or vice versa  in known topologies and  expect the circuit to behave the same way  As one matures in circuit design  you will see that  many factors result in topologies that produce the same result are structurally very different for  MOSFET and BJT implementation  For example  biasing is dealt with very differently for these  two topologies     5 11 MOSFET Spice models      this Model is from supertex com      MODEL NMOS_2N7000 NMOS  LEVEL 3 RS 0 205 NSUB 1 0E15   DELTA 0 1 KAPPA 
4.   Spring 2005    Next  a description of the model and its parameters will be given  and then what is known as the  basic MOSFET canonic cells will be present and discussed  One can see from Figure 5 8 that at  low frequencies the MOSFET behaves like a voltage controlled current source  VCCS   This is a  little different than its cousin  the BJT  It will be presented in later experiments that the BJT is  treated like a current controlled current source  The MOSFET takes any modulated signal  applied to the gate and multiplies it by the small signal forward transconductance  Even though  the MOSFET and the BJT are very closely related  they have some very distinct differences     The MOSFET has an input resistance that is significantly higher  In fact  at low frequencies the  input resistance is infinite  The MOSFET has superior input signal to output current linearity  performance  Unlike the BUT  the MOSFET is a majority carrier device  Therefore  the MOSFET  experiences a negative temperature coefficient  Where any rise in temperature causes the output  current of a BJT to rise  the opposite is true for the MOSFET  In terms of power consumption  the  MOSFET also outperforms a bipolar device with lower power consumption     About now one might be questioning why BJT transistors are still around if MOSFETS has so  many superior performance characteristics  The truth is the MOSFET does yield to the bipolar  devices in some analog performance categories  The MOSFET lacks the for
5.  16 General Report Format Guidelines                                 eese 29    B  Madhavan Page 3 of 29 EE348L  Spring 2005    Figures   Schematic diagram of an NMOS and PMOS transistor                                                 5  A cross section of NMOS transistor in 530131101900000 6600600                                                                 6  A P lype  MOS Capac eo 7    Simulated ip vps characteristics of an n channel MOSFET  2N7000  for different gate  tO SOUCO VON AO CS caia iS eee             d EE 10    Blasing   a MOSEET   eiat panlo eot Duas cosa oun           e                           bio dua cns  11  MOS  CUTE MINON suse 1 cia ocio 12  Large signal high frequency model of a MOSFET  00 0                                                  13  Low frequency small signal MOSFET model      066660066 000000                                                      14  A MOSFET connected as a 0100    600006                                                            0    nnne 16  A Commiorisource ambplifiGl  Xsis inai         17  A small signal model of a common source amplifier                                 18  Common drain  or source follower  canonic Cell                ooocccccconnnccccoccnconononnnnnnnnnnnos 19  A common gate canonic Cell                   ooocccoccccoonncononnccnonnncnnnccnannnnnanononanonnanononannnnnnns 20  HSpice netlist for obtaining l V characteristic of an n channel MOSFET  2N7000    22    ip Vps characteristics of MOSFET m1 in F
6.  2  Discussion  Answer all the questions in the lab  For each laboratory exercise  make sure that  you discuss the significance of the results you obtained  How do they help your  investigation  Explain the meaning  the numbers alone aren t good enough    3  Conclusion  Wrap up the report by giving some comments on the lab  Do the results clearly  agree with what the lab was trying to teach  Did you have any problems   Suggestions     B  Madhavan Page 29 of 29 EE348L  Spring 2005    
7.  for the sake of completeness  it should be noted that if  the drain and source aren t at the same potential  then your circuit will experience a phenomena  that is known as the body effect  We won t go into much detail of this second order effect in this  experiment  but it should be conveyed that this is an important issue when dealing with analog  integrated circuit design  A threshold voltage shift will result from a topology were the Vss is not  equal to zero     5 5 Biasing a MOSFET    This section will cover the biasing of an n channel MOSFET amplifier shown in Figure 5 5  The  n channel MOSFET is to be biased in the saturation region  at an operating point of desired drain  current  drain voltage  and gate voltage  The use of the quadratic relationship  equation 5 3   requires knowledge of the mobility  oxide capacitance per unit area  the width and length of the  device  and the threshold voltage  For discrete components  these values vary too much for the  quadratic relationship to be a good predictor  One can measure these quantities in the laboratory   but the idea here is to get a design that works without knowing all of the device parameters    B  Madhavan   10 of 29  EE348L  Spring 2005    beforehand  For this example  let us assume that we looked up the data sheet of a discrete  MOSFET device that we are interested in  and determined that its threshold voltage  Vi  is in the  range of 1V to 3V  Remember that V4  must exceed the threshold voltage  Vin  for curr
8.  resistance seen is ideally infinite     The gain of the circuit is not as easily calculated as the input and output resistances  but simple  KVL and KCL equations should yield the following result     B  Madhavan Page 17 of 29 EE348L  Spring 2005       Figure 5 11  A small signal model of a common source amplifier     One can see from equation 5 18 that the gain of this amplifier greatly depends on the resistance  connected to the drain  Referring back to equation 5 10  one can see that the MOSFET gate  aspect ratio  W L  and the drain current  also determine the gain  This is comforting that a  designer has a variety of controllable parameters that can determine the gain of the topology   Unfortunately  it can bee seen that some of the variables that control the gain are device  fabrication process dependent  Problems may arise when dealing with process tolerances that  can be on the order of 20   Another draw back  which was pointed out earlier  is that the  transconductance of a MOSFET is well below what can be achieved with other device  technologies  Therefore  to achieve comparable gain  more than one stage maybe needed  The  common source amplifier example presented here neglected the influence of the MOSFET  channel resistance and the external resistance between source and ground  This will be left as a  pre lab exercise     5 8 3 Common drain amplifier canonic cell    The next MOSFET canonic cell that will be presented will be the common drain amplifier  which is  c
9. 0 0506 TPG 1 CGDO23 1716E 9   RD 0 239 VTO 1 000 VMAX 1 0E7 ETA 0 0223089   NFS 6 6E10 TOX 1   02 77 LD 1 698E 9 10 862   5  TXJ26 46066E 7 THETA 1 0E 5 CGSO 9 09E 9 L 2 5E 6   W 0 8E 2        TO 92  2N7000    Figure 5 17  Pin diagram of the 2N7000  Courtesy of Fairchild Semiconductor      5 12 Revision History    This laboratory experiment is a modified version of the laboratory assignment 5  MOSFET Static  Operation  and laboratory assignment 6  MOSFET Dynamic circuits  created by Jonathan  Roderick     5 13 References     1  Avant  HSpice User Manual  Version 2001 4  December 2001  posted on EE348L class web  site     B  Madhavan   24 of 29  EE348L  Spring 2005    Avant  HSpice Device Models Reference Manual  Version 2001 4  December 2001  posted on  EE348L class web site     Bindu Madhavan  EE348L Laboratory Experiment 3  Spring 2005     Gerald W  Neudeck  Volume I  The PN Junction  Addison Wesley Publishing Company   Reading  Massachusetts  1989     Ben G  Streetman  Solid State Electronic Devices  Prentice Hall Inc   Englewood Cliffs  New  Jersey  1990     Richard C  Jaeger  Introduction to Microelectronic Fabrication  Addison Wesley Publishing  Company  Reading  Massachusetts  1993     S  M  Sze  Physics of Semiconductor Devices  John Wiley  amp  Sons  Inc   New York  1981     Paul R  Gray  amp  Robert G  Meyer  Analysis and Design of Analog Integrated Circuits  John  Wiley  amp  Sons  Inc   New York  1993      2      3    4      5      6      7    8     5 14 Pre lab E
10. KKKK                                          M x x XB                            MA X X X         S                                KK Kk                                                                 TEMP 27                                                                                                    S                          KC         MK KG KK                                     M                       CK CK CK SK         KKKKKKKKKKKAKA ck      ROBE  ame ly            ELON                                                                                                    Kk                     MA M X         x8                                                                             CK CK                          Ck            OCC    KOC       dc vdrain 0 5 0 0 01 sweep vgate poi 3 2 0 3 0 4 0                               KK KKK                                            ck                          MA                                                KKEKKKKKKKKKKKKKKKKK KKK KKK     OENE Seoblon           AENA PEOS c                                                                                                         Kk                            X X                       XB                                                                          CK CK                       Ck                   2             6   6   2   6      see pages 8 63 to 8 66 of b user manual  Version 2001 4   probe dc idrain   part Samy     probe dc cga   par   D dy    sprobe  de cgs   par
11. Laboratory Expenment 5       EE348L    Spring 2005       B  Madhavan  Spring 2005    B  Madhavan Page 1 of 29 EE348L  Spring 2005    B  Madhavan   2 of 29  EE348L  Spring 2005    Table of Contents    5  Experiment AS MOSES id 5  SM Bl A A Lm Um 5  92    LO E e EU O o       r oa 5   couse 5                   MOSFET ASC aaa    9 2 1   DS    MOS       T 6  04  MOSFET ee 8  5 5  3Bl  sing 3  MOSEET it do cabo cdd MS Pau 10  95  AMOS CUTE MIO tios 11  54 MOSFET High Frequency Model        nie                                      rds       Oe              eds 12  5 8 Small Signal Canonic Cells of MOSFET Technology 060006660006006                                                   16  5 8 1 DiodescomnectsdMOSEE Tui aco ere iud tert Gies icu             cima 16   17                                                                                     0 0 000 Common source amplifier canonic Cell    0 8 2   18                                                                                       Common drain amplifier canonic Cell       5 8 3   19                                                                                                     Common gate amplifier canonic Cell    5 8 4   9 9  MOSFET Simulation IAS DIC             ede etu Uus due ur mend 20  9 10 Conclusio et PP Hc 24  5 11 MOSFET SPICE Models  iors a         tn Ete on 24  5 12 REVISION PIISTOIY ia                          a nak                  E 24  9 13 AP 24  9 14 Pre laD EXCICISCS aia aa 25  9 15 LAD Re e nO E 28  5
12. OSFET  The accumulation region will be the first region that will be  addressed in a p type capacitor  We assume that the Bulk terminal is grounded and that the Gate  voltage is with respect to ground     The  accumulation  region results when the biasing voltage is less than zero  Va  lt  0  Since a  negative potential is put on the metal gate just above the thin oxide  holes are attracted from the  bulk to the oxide and start to pile up  or    accumulate    a channel of holes at the oxide interface     The    depletion    region is reached when the voltage applied to the gate is greater than zero  yet  less than the threshold voltage of the device  O  gt  Ve  lt  Vin  where Vi  is the threshold voltage  In  the depletion region  the gate voltage is not great enough to attract any significant number  electrons from the substrate  As the positive gate bias is increased  the holes that are located at  the oxide interface are pushed away from the oxide  Thus creating a    depleted    channel of the  majority carriers  holes  and creating a channel of fixed ions  As the gate voltage is increase  the  minority carriers  electrons  start getting pulled to the oxide layer form the substrate  This  continues until the device threshold is met     The device threshold voltage  Vn  is defined as the voltage it takes to    invert    the channel under  the oxide of a p type capacitor to an n  concentration  At this point  the MOS capacitor has  reached  inversion   Vg  gt  Vin  This cond
13. annel resistance  the equivalent resistance of the diode connected transistor can be  found to equal ry  The proof of equation 5 17 is left as a pre lab exercise     T PO  The next three canonic cells that will be presented are known as the common source  common  drain  and common gate  All three have applications in analog circuit design  They get their  respective names from the way they are connected  Ignoring the bulk terminal for a second  the  MOSFET effectively becomes a three terminal device  Each canonic cell will have a signal input  and signal output at one of the terminals  Since we are treating the MOSFET as a three terminal  device  one terminal is not used in part of the signal flow and thus is connected to ac ground     This is where the canonic cells get their name  The terminal that is leftover is effectively the  common terminal      5 17     B  Madhavan   16 of 29  EE348L  Spring 2005    5 8 2  Common source amplifier canonic cell    In this section  the common source is explored  Notice that the input is applied to the gate  while  the output is taken at the drain  The primary purpose of this cell is to provide small signal gain   Another key characteristic of this topology is its inherent high output resistance  Looking at the  small signal model  one can see at low frequency the device effectively has infinite input  resistance  Both proofs will be left as pre lab assignments  The input and output impedance  characteristics determine that the common sou
14. drain diode 2        Figure 5 8  Low frequency small signal MOSFET model     Notice that all the capacitances are neglected in the low frequency model  Therefore  by definition  the  validity of the low frequency model is limited to operating frequencies where these capacitors act as  open circuits  For the purposes of this lab  the models and theory presented will focus on the NMOS  transistor  The following models also apply for the PMOS transistor with the slight modification of  reversing the direction of all controlled current sources and branch currents  and a reversal in polarity of  all port and branch voltages     Note  The small signal model is just a tool that is used to help circuit designers analyze circuits utilizing  MOSFETs  Remember  this tool is only valid if the transistor is operating in the region of validity of its  small signal model  Therefore it should be understood that when using the small signal model   significant effort has been made to ensure that the signal being processed in the amplifier is not too  large  ensuring that the dc bias conditions are not significantly disturbed  This validates the    small  signal    assumptions  allowing the valid linearization of the non linear characteristics of the device  A  large enough signal may cause the transistor to leave its linearized region of operation if its signal  change has a magnitude large enough to offset the set Q  biasing  point  causing signal distortion     B  Madhavan   14 of 29  EE348L
15. e seen that the 2N7000 MOSFET has  Wz8000 um  L 2 5 um  and T    0 1 um  How close are the measured values to the  calculated ones in pre lab problem 2  Does varying the value of W  the width of the  MOSFET  in an HSpice simulation of Figure 5 20  with element values from the circuit  that you have designed  improve the match between simulated and measured results        Figure 5 20  Circuit schematic for Laboratory experiment 5 exercise 1    2  Using Figure 5 20  repeat pre lab problem 3  using circuit element values from lab  exercise 1  How do your results compare to the calculated results from pre lab problem  3  Plot your measured results     B  Madhavan   28 of 29  EE348L  Spring 2005    Using Figure 5 20  repeat pre lab problem 4  using circuit element values from lab  exercise 1 above  How do your results compare to the calculated ones from pre lab  problem 4  Plot your measured results     Using the results from lab exercises 2 and 3 above  use the procedure in pre lab problem  5 to determine the optimal biasing voltage range from measured data  Plot your results     Build and verify the biasing example that was presented for a MOSFET in Figure 5 5   Take care that you look up the manufacturer s datasheet to determine the  threshold voltage range  minimum  typical  and maximum values  of the particular  discrete MOSFET device that you are using  Are your measured results with in  2  of  the specifications the circuit was designed for  If not  adjust resistor values u
16. ent to flow     Say we desire a drain current of 1mA  We assume Vi    3 0V  worst case Vn in range of 1V 3V    We set Vg    3 25V so that we have Vys  Vin   0 25V of worst case gate source overdrive voltage   Next  a 3 75V gate voltage is arbitrarily chosen  Given that we want V4    Vy     Vs  3 25V  this  dictates that V   0 5V  Using Ohm s law  we get the source resistance  Rss   0 5V 1mA   500    Making sure the condition for saturation  V  s gt   Vgs Vin  is satisfied  the drain voltage is chosen to  be 3 5V  Vas   3 5V   0 5V   3 0V   With a supply voltage  V4475V  and drain current of 1mA  this  requires a 1 5kO resistance  R4  between the supply and the drain terminal  Next  in order to set  the gate voltage to at 3  5V  we use a voltage divider as shown in Figure 5 5 to derive V     3 75V from the supply  Vgg 5V  The resistor ratio of Rp4  Rp2 needs to be 1 3  Therefore we set  Rp47 1kO  and Rp2 3kQ  Note that the bias network requires 1 25mA from the 5V supply     For a MOSFET  the quadratic relationship dictates that the sensitivity of         to Vgs is not as severe  as that of the I V relationship of a diode  which is exponential  This means that V   has to vary a  great deal more than say  V   the applied voltage across a diode  for the same range of currents   Sometimes  due to tolerances in fabrication  it can be tricky to achieve the exact biasing current   However  a simple solution is to make one of the gate resistors  say Rp2  a potentiometer  This  allows 
17. ference current by  choosing Ms to have a larger gate aspects ratio  W L  than the reference  In the lab we use  discrete components with fixed dimensions  so this seems like it would present some difficulty  when larger  W L  ratios are desired  However  one may achieve a larger ratio by paralleling  devices  Some drawbacks to this approach include taking up a lot of space and being limited to  integer multiples of the reference current  The major problem with this current source  in the lab  and in IC design  lies in the dependence of the currents on Vas  which differs for each device   Analysis of this current mirror leads to           Vig   Lop R  Vg  5 6   Lie   A  v f  1  AV    5 7   l       E  v    V  P  Av   5 8   Dg Ka TEANG  5 9     La Ko 1   AV ds  Thus  the ratio is not 1 1 as is hoped  In IC design  the K  factors will be very close  as matching  is a strong point of IC fabrication processes  However  in the lab and in IC design  regardless of  whether the lambda terms are equal  the drain source voltages are necessarily different for  different drain resistances  making it impossible to match the currents over a wide range of loads   In the lab  you will use a potentiometer for the load  and observe the variation in current as the  load  and hence the drain source voltage  varies     5 7 MOSFET High Frequency Model    This experiment will build upon the concepts that were presented in the previous lab and  introduce dynamic circuits using MOSFETS  In the previou
18. g  conditions stated above  Going back to the switch analogy  the gate source voltage determines if  the device is    on    or    off     Cut off occurs when the gate source voltage is less than the device  threshold voltage  Vys  gt  Vin  If the device is in cut off  the drain current  l4  is approximately zero  and the device is considered off  This condition is independent of the drain to source voltage     B  Madhavan   8 of 29  EE348L  Spring 2005    Now the truth of the matter is the MOSFET doesn   t act like a perfect switch that turns off and on   Current does flow in sub threshold gate biasing  but for the purposes of this lab it will be assumed  the drain current is small and approximately zero when V     lt 0  The other two stages of operation  assume the gate source biasing is above threshold  V4 20  and depend on the biasing of the  drain source  The equations describing exactly how drain source voltage influences channel  charge  and in turn the current  are incredibly complicated  However  simplified analysis shows  that the current depends roughly on the square of the gate voltage for Vas 2 V4   Vi  saturation  region   and roughly linearly for Va   lt  Vgs  V   triode region   This assumes the devices are large  enough to avoid velocity saturation  Be careful not to confuse the linear current dependence of  the triode region with the linear operation of the device  When one talks about the linear  operation of the device  they are referring to the small signa
19. ic shortcomings of the stand alone canonic  cells     5 2 Theory    5 2 1 MOSFET Basics    The MOSFET comes in two varieties  namely  NMOS and PMOS  This lab will primarily deal with  NMOS devices  It should be noted  that all equation presented for the NMOS transistor are valid  for the PMOS device  as long as all the voltage polarities and current directions are switched  As  stated above  the MOSFET must be biased in the proper regime in order for it to be used as an  amplifier  so this will be the fundamental focus of this lab  The schematic diagrams of an NMOS  and PMOS are presented in Figure 5 1     Drain Source    Gate Gate          Bulk   Bulk    Source Drain    NMOS PMOS       Figure 5 1  Schematic diagram of an NMOS and PMOS transistor     B  Madhavan Page 5 of 29 EE348L  Spring 2005    A cross section showing a typical NMOS device is shown in Figure 5 2  a PMOS device would  be identical  but with n type and p type materials reversed   It can be seen in Figure 5 2 that a  NMOS transistor has a P type substrate  To avoid confusion  the name for the MOSFET comes  from the generated carrier channel that occurs between the source and the drain  not from the  bulk material the device is fabricated in  The channel and how it is formed will be discussed  shortly     Source    Pinch off    Channel of electrons  P substrate       Figure 5 2  A cross section of NMOS transistor in saturation     Functionally  the drain  gate and source terminals are the equivalents of the bi
20. igure 5 14 for gate to source voltages of 2     9 c VOLES 0            00000000700 0    1       00909002022005 23  Om Versus             Characteristics of MOSFET m1 in Figure 5 14 for gate to source  Voltages o1 2  aand  AVONS  2555991 modes ibo Ren pei esent                       ade iio 23  Pin diagram of the 2N7000  Courtesy of Fairchild Semiconductor                            24  Circuit schematic for Laboratory experiment 5 pre lab exercise 9                             26  A commion  so  rce amiplillGr    atte ooa           27  Circuit schematic for Laboratory experiment 5 exercise 1                                         28    Table of  Figure 5 1   Figure 5 2   Figure 5 3   Figure 5 4     Figure 5 5   Figure 5 6   Figure 5 7   Figure 5 8   Figure 5 9     Figure 5 10   Figure 5 11   Figure 5 12   Figure 5 13   Figure 5 14   Figure 5 15     Figure 5 16     Figure 5 17   Figure 5 18   Figure 5 19   Figure 5 20     B  Madhavan   4 of 29  EE348L  Spring 2005    5 Experiment  5  MOSFETs    51 Introduction    Transistors are at the heart of integrated circuit design  As active elements  they are capable of  implementing gain stages  buffers  electrically operable switches  op amps  and a host of other  applications  The word active refers to the fact that transistors require static power  from a power  supply for transistor bias current  and or voltage  to operate in the desired operating region   Circuit designers use the small signal model of transistor for analysis tha
21. ition is know as inversion because the applied bias has  attracted enough minority carriers  electrons  that the area directly under the oxide looks like an  n material  thus it is inverted  One may ask  what is the difference between inversion and  depletion  In inversion the bias on the gate is large enough to attract a large and significant    B  Madhavan Page 7 of 29 EE348L  Spring 2005    number of electrons  so the surface under the oxide is thus inverted from the original  unbiased   p  concentration to an n  concentration     9 4 MOSFET    A cross section of a MOSFET was shown in Figure 5 2  It can be seen that a MOSFET is nothing  more than a MOS capacitor with a source and drain at either end  Since half of the MOSFET structure  was explained earlier  a discussion of how the drain and source contribute to the functionality of the  transistor will be presented     A simplified way of thinking about the operation of a NMOS is to compare it to a switch  When the  Switch is    on    conduction needs to occur and thus current flows between two contacts  If the switch is     off     then no current flows and the switch behaves like an open circuit  Think of the gate as an  electrically activated switching lever and the source and drain as two contacts that just happen to be  heavily doped n type material  Since the source and drain are comprised of n type material  electrons  must be transported from source to drain for current to flow between them  Remember a MOS  capaci
22. l dynamic operation  This occurs  when the transistor is biased in the saturation region  Simulated ip versus Vas curves for multiple  Vgs Voltages for a discrete n channel MOSFET device  2N7000  are shown in Figure 5 4  One  can see the two different operating conditions the MOSFET experiences as Vas is swept  namely  the triode and the saturation regions     A summary of the three different operating regions and the associated drain current in each is  presented below for the NMOS  The equations below also hold for the PMOS transistor if the  polarity of all voltages is flipped   Note  The threshold voltage  Vip  for a PMOS is negative            NMOS   1 90  V   lt V    cut off   5 1   V  gt V   1  Zya V     V   4 GAV  oom  triode   5 2   L B 2 0 gt  V    V   V     ino Vass     n    A ATEN A eaten   5 3   2 L    Vas  gt  Es B Va   Where     54                                x  Cox   f  5 5     OX    Table 5 1 summarizes the variables and their units used in equation 5 1 5 5     Table 5 1 MOSFET parameters    W  Widthofthe transistor  om             L   Channel length  um     W  L  An  tox  Eox    tx      Oxide thickness  um     Permittivity of the oxide  3 9  8 85E 14   F cm     K  is a constant given by the product of mobility and oxide capacitance per unit area  W L is the  ratio of oxide width to channel length  V4  is the threshold voltage  One final note is that if the       B  Madhavan Page 9 of 29 EE348L  Spring 2005    substrate is at a different voltage than the s
23. ld be clear that if the source sits at ground and the drain is at some positive  voltage  there will be a depletion region around the drain  note that the drain and substrate form a pn  junction   This depletion region wants to form all around the drain to where the drain meets the oxide   since the inverted channel exists between source and drain  the result is that the depletion region  pinches off the channel right near the drain for gate to drain voltages less than the threshold voltage   i  amp    Vag  gt   Vin   Pinch off is highlighted in Figure 5 2  As the drain voltage is increased  the depletion  region extends farther from the drain  shortening the channel length  The obvious question is how do  electrons travel from source to drain if the channel doesn t extend the entire way  The answer is that  electrons are swept from the channel to the drain by the strong electric field associated with the  depletion region     Since the biasing regimes were discussed for the MOS capacitor  they will now be presented for  the MOSFET  To be sure  they are not the same  The biasing of the MOSFET depends on two  voltages  namely the gate to source and the drain to source voltages  When dealing with analog  circuits  one must ensure the biasing is correct for the desired operation  which more often than  not is the linear region  There are three region of operation for the MOSFET  cut off  triode   a k a  ohmic   and saturation  These three regions are determined by the two biasin
24. nductor devices requires the specification of an appropriate device  model deck in HSpice  The model deck specifies a particular mathematical model of the device  being simulated and the values of the parameters associated with the model  Model parameter  values that are not specified default to the default values specified in HSpice  The interested  reader can determine the default values associated with a particular model by searching the  HSpice Device Models Reference Manual  version 2001 4  December 2001     An example of an HSpice model deck specification for 2N7000  the discrete n channel MOSFET  used in this laboratory assignment  is shown below  The model deck is obtained from  www supertex com  Note that the model deck starts with the keyword  MODEL  followed by the  particular n channel MOSFET model name  nmos_2N7000  followed by the keyword NMOS  The          character is a continuation character that indicates that the model deck specification continues  on that line      MODEL nmos 2N7000 NMOS     LEVEL 3 RS 0 205 NSUB 1 0E15    DELTA 0 1 KAPPA 0   6 TPG 1 CGDO 3 1716E 9   RD 0 239 VTO 1 000 VMAX 1 0E7 ETA 0 0223089   NFS 6 6E10 TOX 1  0E 7 LD 1 698E 9 110 862   5   XJ 6 46606E 7 THETA 1 0E 5 C6GS0 9 095 9    Very Important Point     It is very important to start the model deck with the  MODEL keyword  followed by the mosfet  model name and then the keyword NMOS for an n channel MOSFET  It is good practice to put  the device models at the end of the netlist befo
25. nt  to  calculate and plot ip versus vps for various gate source voltages  varying Vas from 0 5V to  5 0V in steps of 0 5V  10 ves data points   Use vps  6 5V and Vps2 9 0V and calculate  the corresponding drain currents  Use these data points to calculate the drain to source  conductance  ga   mS   using the equation below  Plot the ten data points of gy  so  obtained against the gate source voltage  vas       OL a    1             V   cons tant V  E Vi    g ds m 0 V  ds 5 V   cons tant    As a circuit designer  it is sometimes advantageous to find the optimum biasing condition  for a MOSFET  The optimum biasing condition occurs when gm is maximized and gas is             Note     1     2     3     4     9     B  Madhavan Page 25 of 29 EE348L  Spring 2005    minimized simultaneously  Used the data you calculated to plot the ratio     0   0    versus  Vas  What is the optimal biasing voltage range for the transistor        Figure 5 18  Circuit schematic for Laboratory experiment 5 pre lab exercise 9    The example of the common source amplifier in Figure 5 10 neglected the drain to   source resistance  ro    1 94s   and any external resistance connected between the source  terminal and circuit ground  Figure 5 18 features a common source amplifier with an  external source resistance  Rss  Re derive the gain of the common source amplifier   taking into account the drain to source resistance  r   7 1 94s   and the external resistance  Rss  Notice that the bulk and the source te
26. ntil they do   Record any changes that you made  From what you have learned  can you speculate  why there were discrepancies between theory and measured data     Build the circuit in Figure 5 19  Apply a 50mV peak to peak 4kHz sinusoidal signal at the  input  Measure the output signal at the drain of the MOSFET  Do your results agree with  your calculations and HSpice results from pre lab question 8  Why or why not     Using the same circuit  connect a load of 1Meg Ohm at Vout  Measure the output signal at  the drain of the MOSFET  and calculate the gain  Did your results change from what you  observed in the previous exercise  If so  why  Repeat this procedure for load values of  50k  5k  1k  500  and 50 ohms  Did your results change for any of these values  If so   why  Does this confirm your answer to pre lab problem 5     Design a common source amplifier that has 1mA of drain current  but double the gain as  the circuit from lab exercise 6  Propose three different solutions for achieving this goal   What parameters and or circuit elements can you use to accomplish this  Do any of the  three solutions violate limitations of the device  i e  current limitations which is 200mA   power limitations which is 200mW for a 2N7000   If they are physically possible  verify  the operation of your purposed solutions     3     4     9     6     1     8     5 16 General Report Format Guidelines    1  Data  Present all data taken during the lab  It should be organized and easy to read   
27. ommonly referred to as the source follower amplifier as the voltage at the source terminal of the  MOSFET follows the voltage at the gate terminal  In this topology the input is once again applied  at the gate  However  the output is now taken at the source  It will be demonstrated that the  common drain acts like a voltage buffer  However  one major issue with this circuit arises from  the fact that it isn t a great voltage buffer because it yields a gain that is less than unity  The proof    B  Madhavan   18 of 29  EE348L  Spring 2005    of this is left as a pre lab exercise  Even though the gain of this circuit is suspect  it can be shown  that like a voltage buffer the common drain topology has a large input impedance  and very small  output impedance  The common drain is shown in Figure 5 12  It is assumed that the transistor  is biased in the saturation region  so all biasing circuitry has been neglected        Figure 5 12  Common drain  or source follower  canonic cell     Replacing the MOSFET schematic symbol with its small signal model  neglecting ro  assuming  low frequency operation  the voltage gain  Ay  input and output resistance are found to be     R  A    Po KuBm  5 19   V  1 R 8   14 4   R      5 20   1   5 21     ie d   TREE    Equations 5 19 through 5 21 show the common drain tries to emulate the characteristics of a  voltage buffer  However  it can be seen in equation 5 19  that the gain of this circuit can never be  unity  In fact  the solution for A  pre
28. one to tune and monitor the desired MOSFET performance        Figure 5 5  Biasing a MOSFET     5 6 AMOS current mirror    The MOS current mirror discussed here is used to properly bias analog circuits  The strategy  invoked in a current mirror is to set a desired current            in one side and have that current  mirrored through another transistor  Current mirrors are used in circuit design so one can set a  specific current without disturbing the circuitry it that it is biasing  A current mirror is shown in  Figure 5 6  Notice that             is set in transistor M   since transistor M  and M  have the exact same  Vos  then the two transistors conduct the same amount of drain current  Hence             equals lout   This assumes the transistors are    matched     When transistors are matched  then all their  parameters are equal  i e  Un  Cox  etc    An analysis of a current mirror is left as a pre lab  exercise     B  Madhavan Page 11 of 29 EE348L  Spring 2005       Figure 5 6  MOS current mirror     Note that M1 is a diode connected transistor which guarantees that it operates in saturation  so  long as the gate voltage lies at least a threshold voltage above ground  The idea is that R is  chosen to establish the desired reference current in M   and then M  simply mirrors this current  exactly  as M  and M  have identical effective gate source voltages  i e   Vas     Vi is identical for  both   In IC design  one has the additional benefit of being able to scale the re
29. ource  the threshold voltage varies due to the pn  junction between source and bulk  For this lab  the source and bulk will be tied together  so this  effect will be ignored     To recap  for small signal linear operation  one must ensure that the transistor is in the saturation  region  The goal and purpose of this lab is to bias the transistor in the linear region of operation   50 a small signal analysis may be preformed  Be careful not to confuse the nomenclature of the  operation of a MOSFET with the terminology used with bipolar transistor  For linear operation   thus allowing the use of the small signal models  you want the MOSFET in the saturation region   yet you will learn in future labs that you do not want a BJT in the saturation region  It is  unfortunate and sometimes confusing that both transistors use the same terminology for biasing  that yields in different small signal operation        Voltage X  lin   VOLTS    Figure 5 4  Simulated ip vps characteristics of an n channel MOSFET  2N7000  for different gate to source voltages     Threshold shift   Many text books state equations that neglect the A  term in the equations above  They do this  because they have assumed that the bulk and the source are at the same potential  Since we  are using the 2N7000 for the purposes of this lab  these equations are perfectly reasonable  The  2N7000 is a three terminal device that has an internal connection between the source and drain   so A  term may be neglected  However 
30. polar collector   base and emitter  respectively  However  the MOS device is symmetric  so there is no physical  difference between the drain and source terminals  To understand what determines which  terminal corresponds to drain and which to the source  an investigation must be done on how a  bias voltage affects the transistor behavior  For now  in a NMOS device  the drain is the terminal    will the higher potential and the source is the terminal with the lower potential  The opposite is  true for a PMOS device     5 3 MOS Capacitor    To investigate how the MOSFET reacts to different biasing  we will simplify the device structure  into a simple MOS capacitor  The MOS capacitor has the exact same structure as the MOSFET   but without the source and drain  As an understanding of this simplified model is developed  the  complete MOSFET model will then be presented with a discussion on the correlation of the  functionality of the MOS capacitor and the complete operation of the MOSFET     The MOS capacitor is shown in Figure 5 3  The MOS capacitor is like any other parallel plate  capacitor you have seen before  It gets it name form the metal  oxide  semiconductor sandwich it is  comprised of  It should be noted that in today   s MOSFETs  the metal that makes up the top plate of the  capacitor is actually made out of poly silicon  or poly  Poly is heavily doped silicon that has a high    B  Madhavan   6 of 29  EE348L  Spring 2005    conductivity  so it has characteristics ver
31. rce amplifier is best suited accepting a voltage and  delivering a current  This supports the statement made in experiment 5 which explained that the  MOSFET is effectively a voltage controlled current source  A common source amplifier is shown  in Figure 5 10  It is assumed the transistor is properly biased  so external biasing  DC  circuitry  is neglected        Figure 5 10  A Common source amplifier     Replacing the schematic symbol of a NMOS in Figure 5 10 with the small signal model in Figure  5 8  one can calculate the gain  input impedance  and the output impedance  Figure 5 11 shows  a common source amplifier utilizing the small signal model  However  it has assumed low  frequency operation  neglected channel resistance ro and assumed the drain and source  resistances are negligible     Notice the small signal model in Figure 5 11 neglects to include any voltage source resistance   Rs  At very low frequencies  it can be seen by inspection that the input resistance is infinite  thus  neglecting the source resistance is not an unrealistic assumption that is only valid in an academic  setting  However  at high frequencies  this assumption fails and one must account for the source  resistance for any analysis to be accurate  One can also see  if neglecting channel resistance   that the resistance seen looking into the drain is also infinite at low frequencies  By inspection  you will notice that when looking into the drain one is staring at two current sources  thus the 
32. re the final  END statement     The internal model variables of the MOSFET model may be plotted or used in expressions  The  internal model variables that are accessible to the user are detailed on pages 8 63 to 8 65 of the  HSpice user manual  version 2001 4  December 2001     Figure 5 14 is an example of a netlist that can be used to plot the ip vps characteristics of the  MOSFET 2N7000  specified by the model deck named nmos 2N7000 in Figure 5 14  The drain  to source voltage  vps  is swept from OV through 5V in steps of 0 01V at gate to source voltages   Ves Of 2V  3V  and 4V  The HSpice simulation results are shown in Figure 5 15  Refer to  Laboratory assignment 3 or the HSpice user manual  version 2001 4  December 2001 for help on  plotting using mwaves awaves     MOSFET I V chardcteristic   Written Feb 24  2005 for EE348L by Bindu Madhavan     A         KK KK KA X                                     9           Kk KK KK KK                  KC           Ck CK Ck KC KC Kk ok K KC ok ok Kk KC Kk Kk Kk Kok Kk Kk Ko Kk Kk Kk                  IERA options section                  ck ck ck ck ok ok ok ok ok kk ck ck ck ck ck ck ck ck ok ok ok ok ck ok k AAA ok                                       ok           ck                                                                   AAA     options post 1 brief nomod alt999 accurate acct 1 opts dccap 1    B  Madhavan Page 21 of 29 EE348L  Spring 2005                                                                                  
33. rminals are not at the same potential  The bulk   to source transconductance  gays  must be taken into consideration during the small   signal analysis  How did the external source resistance affect the gain of the common   source amplifier     It was stated that the common drain amplifier in Figure 5 12 has less than unity gain   From what you see in equations 5 19 through 5 21  can you speculate why  Derive the  gain  and output resistance of a common drain amplifier without neglecting the drain to   source resistance  ro  Did including the drain to source resistance ry  make this canonic  cell perform better or worse as a voltage buffer  compared to what was derived in  equations 5 19 through 5 21 when channel resistance  ro  was neglected      6     T     B  Madhavan   26 of 29  EE348L  Spring 2005       Figure 5 19  A common source amplifier     Using what you have learned  calculate the transconductance  g    of the transistor and  the voltage gain  Ay  of the common source amplifier whose schematic is shown in  Figure 5 19  which is based on the biasing example in Figure 5 5  Hence you will  measure the output at the drain and input your signal at the gate  Be sure to use  coupling capacitors  C   so that the biasing of the circuit is not disturbed  Assume that the  coupling capacitors  C   act as short circuits at the frequency of the input signal  Verify  your results in HSpice     It was discussed earlier that the input resistance and output impedances of a common  
34. s sections  we focused on properly  biasing the MOSFET and we learned that the purpose of biasing an analog circuit is so the active    B  Madhavan   12 of 29  EE348L  Spring 2005    devices within the circuit operate in a desirable fashion  linear  on small signals that enter the  circuit  Once the MOSFET has been biased in the dynamic linear region  a k a  saturation  one  may use the large or small signal model developed to perform dynamic circuit analysis     Signals are perturbations about the bias point  or quiescent point  a k a  Q point  and carry all the  important information for your circuit to process  For instance  you might bias your input port at  2V  and then superimpose a 50 mV peak to peak sine wave to this bias voltage  Ideally  you  would like amplifiers to be perfect linear devices  meaning the output signal is some multiple of  the input signal  independent of the input amplitude  There are many ways that information is  modulated  but for the purposes of this experiment we will deal will strictly sinusoidal waves     Transistors are normally non linear devices  recall their l V characteristics   so the device bias  point  and hence the gain  does depend upon the input amplitude  However  by suitably restricting  the amplitude of the input swing  using a    small signal     and correctly biasing the circuit  Q point    the resultant output will show very little distortion  meaning that the non linear circuit acts  approximately linear for small signal de
35. saturation voltage   respectively  and V  is the channel length modulation voltage     B  Madhavan Page 15 of 29 EE348L  Spring 2005    5 8 Small Signal Canonic Cells of MOSFET Technology  5 8 1 Diode connected MOSFET    As stated in the previous lab  the MOSFET can be connected as a diode and this configuration is  shown in Figure 5 9  This circuit is very useful and common when biasing circuits  If you refer  back to section 5 6  one can see that every current mirror contains a diode connected MOSFET     Diode connected  MOSFET    Equivalent circuit       Figure 5 9  A MOSFET connected as a diode     The diode connected transistor is the simplest canonic cell for the MOSFET  The gate in Figure  5 9 is tied to the drain of the transistor  so it exhibits l V behavior close to that of a conventional  PN junction diode  Tying the gate to the drain effectively makes the MOSFET a two terminal  element  If one refers back to the cross sectional model of a MOSFET given in Figure 5 2  in  experiment 5  one can see that a p n junction is formed between the substrate and the drain  The  affect of the n  source is effectively nullified due to the source and bulk being tied to the same  potential  Notice when the MOSFET is connected in this configuration  it is guaranteed to be in its  saturation region  This two terminal device may be modeled as a two terminal resistor seen next  to itin Figure 5 9  Using the low frequency small signal model of MOSFET from Figure 5 8 and  neglecting ch
36. sented above was a first order calculation and thus neglected  higher order effects  Thus the gain predicted in equation 5 19 is a best case scenario and will  more than likely result in a gain that is larger than what you will physically measure in the lab   From what you see in equation 5 19 it will be your job in the pre lab to speculate where the  potential pitfalls may lie in its derivation     5 8 4 Common gate amplifier canonic cell  The last canonic cell presented in the common gate  Notice in this configuration that the input is    connected at the source  while the output is taken at the drain  The common gate finds utility as  a current buffer  One will discover that it has unity current gain  low input resistance  and high    B  Madhavan Page 19 of 29 EE348L  Spring 2005    output resistance  Once again the proof is left as a pre lab exercise  A circuit schematic of a  common gate configuration is shown in Figure 5 13  Note  Once again biasing has been  neglected        Figure 5 13  A common gate canonic cell     The input resistance and output resistance have already been derived from other canonic cells   The input resistance is the same as the output resistance of a common drain  The output  resistance exactly the same as what was found for the output resistance of a common source   Assuming the internal resistance of the current source is ideal and if there are no other paths for  the current to flow  the calculation of the gain is trivial  One can simply see 
37. source amplifier are ideally infinite  Assuming the coupling capacitors  C   act like a short  circuit at the frequency of the input signal  is this still the case once the biasing resistors  are taken into consideration  Calculate the input and output impedances of the common   source amplifier topology seen in Figure 5 19  Do your calculations agree with what was  stated earlier in this experiment  Why or why not     Move the output from the drain to the source of the MOSFET in Figure 5 19  Calculate  the voltage gain of the circuit  Verify your results in HSpice  What canonic cell is this  topology     8     9     10     B  Madhavan Page 27 of 29 EE348L  Spring 2005    5 15 Lab Exercises    Note  See Figure 5 14 for HSpice MOSFET model deck for 2N7000   e Submit plots relevant to reach question in your lab report     1  In pre lab problem 2  you derived expressions to calculate the mobility of electrons   cm  Vs   Mn  and the threshold voltage  V   Vin from a graph of Vigs versus ves  Build the  circuit in Figure 5 20 with V     5V  determine all resistances needed  see section 5 5    Biasing a MOSFET      and measure ips while varying Ves  In this exercise  be sure the  MOSFET stays biased in the saturation region  by adjusting V   and that you take  enough data points to get an accurate model of the ips versus vas behavior  Plot your  results  and calculate un and V4  for this transistor using the data collected  From the  HSpice netlist provided in Figure 5 14  it can b
38. t are appropriate for the  bias condition of that transistor  The static power is consumed so that the input signals may be  amplified  Thus  when one says that transistor amplifier provides gain  one means that the  signals experience gain at the expense of static power consumption     The most common commercial transistor today is the Metal Oxide Semiconductor Field Effect  Transistor  MOSFET   Even though the MOSFET was conceived before the bipolar transistor  it  wasn t until mature fabrications techniques and the digital revolution that the MOSFET became  the dominant transistor used today  Even though the MOSFET has been primarily used as a  digital device  it has made significant contributions to analog circuit design in recent times despite  its relatively poor transconductance compared to the Bipolar Junction Transistor  BJT   primarily  due to the needs for mixed signal circuit driven by integration of multiple functions on a single IC     For the next couple labs  the operation of a MOSFET  as used in analog circuit applications  will  be presented  This experiment will deal with dc operation conditions  a k a  biasing  or quiescent  state  the MOSFET current mirror  and the canonic cells used in MOSFET amplifier design  As  will be seen  the MOSFET can be biased in one of three fundamental regions  This biasing will  determine the linearity of the MOSFET  The next laboratory experiment will deal with using the  canonic cells in combination to over come the intrins
39. that the current  flowing into the source must equal the current leaving the drain  Hence  the common gate has  unity current gain     5 9 MOSFET simulation in HSpice    In this section  we investigate the simulation of the l V characteristics of 2N7000  a discrete n   channel MOSFET  whose datasheet may be found at  http   www supertex com    An HSpice  Level 3 MOSFET model deck for a different device is available on page 8 93 of the HSpice  Device Models Reference Manual  version 2001 4  December 2001     The syntax  see page 8 14 of the HSpice Device Models Reference Manual  version 2001 4   December 2001  fora MOSFET element in HSpice is    mxxx drain gate source bulk mosfet_model_name  W mosfet_width  L mosfet_length    Where drain  gate  source  bulk are the drain  gate  source and bulk terminals of the  MOSFET mxxx  and mosfet_model_name is the model name of the MOSFET as specified in    B  Madhavan   20 of 29  EE348L  Spring 2005    the HSpice MOSFET model deck  w and L are the width and length of the MOSFET respectively   specified in units of meters     Very Important Point     See pages 4 18 to 4 20 of the HSpice user manual  version 2001 4  December 2001 page 8 14  for the general MOSFET model statement  pages 8 21 to 8 26 for the MOSFET equivalent  circuits  8 59 to 8 101 for MOSFET capacitance models  and pages 9 20 to 9 33 for the Level 3  MOSFET model deck  in the HSpice Device Models Reference Manual  version 2001 4   December 2001    The simulation of semico
40. tor with a gate bias that is equal or less than zero has a channel of holes at the oxide interface   thus the same bias effectively places a barrier  a channel of holes  between the source and drain of a  NMOS  These holes block the transport of electrons and thus block the flow of current  Thus  when  the NMOS has a gate bias voltage that is equal or less than zero the transistor acts like a switch that  has been turned    off        To turn the transistor    on     one needs to clear a path in the p type substrate so electrons can flow from  the source to the drain  Going back to the operation MOS capacitor  if a large enough positive bias is  applied to the gate  then an inverted channel forms and becomes this desired path  Once the path is  created  an electric field from drain to source is needed to sweep the electron through the path  Thus   two bias conditions must be met for the MOSFET to properly be turned    on        The picture gets a little more complicated when one considers the effect of the drain voltage  Ideally we  would like only the gate terminal to influence the current  thus the device would act like an ideal current  source from the perspective of the source and drain  Ideally  in the sense that this current source   which is connected from drain to source  doesn t depend on the voltage across it  In actuality  the drain  voltage impacts the current  but hopefully to a much lesser extent than the gate voltage  From earlier  discussions of diode  it shou
41. viations about the bias point     Ca  H    AO    OmbsV bs    H  Cos    E  Source       Figure 5 7  Large signal high frequency model of a n channel MOSFET whose symbol is shown in Figure 5 1     The MOSFET high frequency  arge signal model is an empirical model and is shown in Figure  5 7  It is called a large signal model because the values of model elements are dependent on the  dc bias voltage and current conditions of the device  In Table 5 2 you will find a list of what each  element represents in the MOSFET large signal model  As you can see all elements are  physical  unlike the BJT  which will be presented in future labs  where it is based off a Taylor  series expansion  The model in Figure 5 7 looks very complicated  This model can be simplified  for a first order analysis  If the signal of interest is a    small signal     the frequency range of interest  is small enough and processing conditions are good  then many of the elements in Figure 5 7  maybe neglected for a simplified back of the envelope calculation  For many cases this first order  analysis is perfectly acceptable  If conditions arise where the model fails  then the insight learned  from it should be built upon and used to accurately account for any second order effects  A  simplified NMOS low frequency small signal model is found in Figure 5 8     B  Madhavan Page 13 of 29 EE348L  Spring 2005    Table 5 2 MOSFET large signal high frequency model parameters    Cas   Gate Source Capacitance   Dea   Bulk 
42. ward gain and  bandwidth that can be achieved with equivalent bipolar devices  The transconductance  generated by a BJT increased linearly with the Q point current  The small signal forward gain of  a MOSFET increases at a factor of the square root of the Q point current  This equation for the  small signal forward transconductance  gm  of a MOSFET is stated in equation 5 10  This  equation neglects channel length modulation effects  Therefore  it can be challenging to achieve  any appreciable gain out of a MOSFET circuit     9I     z   zg      2K       pg  5 10     0    O point L    gs  Where lp is the internal drain current  One will notice that the small signal model has two  dependent current sources  The second one models bulk effects and shows the bulk to source  transconductance  gm  The equation for Gmps is given in equation 5 11           Emos   48m  5 11   Where A  is known as the channel length modulation factor and it is defined in equation  6 3      5 12        Where Vz is known as the body effective voltage  Vr is the Fermi potential  and V4 is Boltzmann  voltage  All three are defined in equations 5 13 through 5 15        y    A As  5 13   N   y   V  nf Za   5 14    V    0 0259V  5 15     The last element that has to be accounted for is the channel resistance  ro  It is defined in  equation 5 16  I  2              ER  5 16   V    Vaso 0 V sso    1 ol     ro OV       0          Q  point  Where Vasa and Vassa are defined as the drain source voltage and the drain 
43. xercises    For HSpice simulations  use the model deck for 2N7000 in Figure 5 14  See HSpice guidelines in Laboratory Experiment 3   Submit plots relevant to each question in your lab report     Pre lab questions 6  7  8  9  and 10 are to be turned in as homework assignment     Plot the parameters rds  vthreshold  and cgtotal in the netlist in Figure 5 14  In  your plots  specify the range of values of             in which rds correspond to a linear resistor  for different values of vas     If given a plot of Vigs versus Vos for a NMOS transistor biased in the saturation region   Cox and WIL  derive an expression to calculate the mobility of electrons  cm  Vs   Un   Could you also determine the threshold voltage  V   Vin  from this data  If so  how  For  both calculations assume that the channel length modulation is negligible  i e   A  0 in  equation 5 2 and equation 5 3     Given K  W L  5E10  A V     Vin 1 2V  and An 0 002V   use Excel  or an equivalent  to  plot ip versus Vas for a given             that assures the transistor stays in the saturated region   Make sure data points are calculated for Ves from OV to 5V in steps of 0 5V  Using the  plot so obtained  determine the transconductance  gm  mS   for each Aves region of 0 5V  from OV to 5V  using the equation below  Plot g   versus the gate source voltage vas       OL a  1 lala    V  constant   V V  e gsl V  cons tant          Em T  OV     Given K  W L  5E10   A V   Vin 1 2V  and A  0 002V  use Excel  or an equivale
44. y much like a metal  Under the poly gate contact is oxide   Oxide is an insulator  and just as in a capacitor  at low frequency no current flows through this insulator   this is because of the very high band gap voltage associated with insulators   Like a capacitor  a  positive voltage applied to one terminal leads to a deposit of positive charge on that terminal  and  induces an equal amount of negative charge on the other terminal     Poly Silicon    P type silicon       Figure 5 3  A P type MOS Capacitor     There are three basic operating regimes for the MOS capacitor  The biasing that is applied to it  dictates which regime the MOS capacitor operates  The three regions of operation are   accumulation  depletion and strong inversion  The following discussion will be for a p type MOS  capacitor  It can be seen that in Figure 5 3 the capacitor has a p type substrate  hence this is  where it gets its name  It will be shown later that the operation of p type MOS capacitor has a  direct bearing on how an n type MOSFET operates  Both the p type MOS capacitor and n type  MOSFET are built in a p substrate  and this is why the operation of the first correlates to the  fundamental operation of the latter  The reason that a MOSFET built in a p type substrate is  called an n type MOSFET is because an n type channel is formed under the gate  more on this  later  The thing to remember at this point is to be careful and not to confuse the operation of a p   type capacitor and a p type M
    
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