User`s Manual Addendum
Contents
1. User s Manual Addendum Z11428VXI RT User s Manual 0004 000058 Revision 1A March 14 2007 0004 000058 Contact ZTEC Instruments Telephone 505 342 0132 7715 Tiburon Street NE Fax 505 342 0222 Albuquerque NM 87109 Web Site www ztec inc com ZTEC Instruments Inc welcomes your comments on this manual All manuals are thoroughly reviewed before distribution We are however grateful for any comments from our users which will further help to improve the content and quality of our documents Copyright 2005 by ZTEC Instruments Printed in the United States of America All rights reserved under copyright laws of the United States and other countries All technical data and computer software documentation contained herein is proprietary and confidential to ZTEC Instruments Inc or its licensor The reproduction and or transmission of this publication in whole or in part by any means electronic or mechanical is prohibited without the prior written consent of ZTEC Instruments Inc ZTEC Instruments Inc and the ZTEC logo are registered trademarks of ZTEC Instruments ZTEC Instruments has attempted throughout this publication to distinguish proprietary trademarks from descriptive terms by following the capitalization style used by the manufacturer Product names listed are trademarks of their respective manufacturers Company names listed are trademarks or trade names of their respective companies LabVIEW Na2. gt lt range gt Parameters Name Type Range lt range gt Float 10 ns to 500 s with 1 2 5 sequence non exact values are rounded down Additional range of 250 ns available MINimum 10 ns MAXimum 500s 24 0004 000058 Name Description Timebase Reference Command Timebase Reference Query The time base reference command sets the delay reference to the left right or to the center of the active waveform e Selecting Position Position entered is used with the TlMebase DELay command to set the time interval between the trigger event and the delay reference point For example if DELay is 0 seconds and REFerence is CENTer pre trigger data is on the left and post trigger data is on the right of the active waveform The time base reference query returns the currently selected delay reference point The data is sent to the output buffer Returns LEFT CENTer or RIGHt depending on the current position selected Command Syntax TlMebase REFerence lt position gt Query Syntax TlMebase REFerence gt lt position gt Parameters Name Type Range lt position String gt LEFT CENTer RIGHt 0004 000058 25 Name Description Timebase Sample Command Timebase Sample Query The timebase sample command is used to select the sampling mode of the oscilloscope REALtime sampling mode causes a comp
3. 14 00 w 12 00 S 5 10 00 oil e Series1 2B 6 00 2 S 4 00 S D 2 00 0 00 Q a EN S O D D el Ko D D PS S P 0 SF oS oS Us EPS ss A i i e Frequency Hz Default Reset L elle Ile SE 32 Default Reset Conditions ion ia io dde 33 Error GOdes iia adi A 34 Commands Index EE 36 IEEE 488 Common Commande sese eee 36 Instrument Specific Commands coria 36 8 0004 000058 List of Figures Figure 1 Sweep Reference of Various Trigger Positions sese eee eee eee Figure 2 Trigger Block Diagram List of Tables Table 1 Affected Part Numbers 0004 000058 10 0004 000058 Introduction 4 Description The ZT1428VXI RT has additional features and capabilities This manual is a supplement to the ZT1428VXl manual It documents the additional functionality commands and specifications Product Options and Part Numbers Affected Part Numbers Z11428VXI RT Table 1 Affected Part Numbers 0004 000058 11 12 0004 000058 Functionality Sweep Controls Sweep Reference Scenarios Memory Window In Window Trigger mer see Post Trigger Trigger Figure 1 Sweep Reference of Various Trigger Positions In Window Trigger In Window acquisition corresponds to the normal acquisition mode where the trigger event falls within the desired waveform window view as shown in figure 1 The waveform size is limited by the maximum sample points at the selected sample rate Post Trigger
4. 5E 0 3 2E 3 5 0E 0 6 3E 3 10 0E 0 12 5E 3 25 0E 0 3 2E 3 50 0E 0 6 3E 3 100 0E 0 12 5E 3 250 0E 0 3 2E 3 500 0E 0 6 3E 3 1 0E 3 12 5E 3 2 5E 3 31 2E 3 5 0E 3 62 5E 3 10 0E 3 125 0E 3 25 0E 3 31 3E 3 50 0E 3 62 5E 3 100 0E 3 125 0E 3 250 0E 3 31 2E 3 500 0E 3 62 5E 3 1 0E 6 125 0E 3 2 5E 6 31 3E 3 5 0E 6 62 5E 3 10 0E 6 125 0E 3 25 0E 6 25 0E 3 30 0004 000058 Trigger Trigger Rate Trigger A Holdoff Trigger B Holdoff Trigger A Events Trigger B Events Pre Trigger Delay Ch 1 2 Level Accuracy Normal Low Sensitivity HF Reject Trigger Sensitivity Positive Normal Negative Normal 50 0E 6 55 0E 3 100 0E 6 100 0E 3 250 0E 6 250 0E 3 500 0E 6 500 0E 3 gt 1 0E 9 1 0E 6 Sample Rate S s Trigger Rate S s 1 0E 0 1 0E 6 2 5E 0 to 100E 0 10 0E 6 gt 250 0E 0 1 0E 9 40 ns to 320 ms 0to655s 1 to 65535 events 1 to 65535 events Pre Trigger Delay Sample Rate S s s 1 0E 0 1 3E 04 2 5E 0 to 100 0E 0 1 3E 03 250 0E 0 to 10 0E 3 1 3E 01 25 0E 3 to 100 0E 3 1 3E 00 250 0E 3 to 1 0E 6 1 3E 01 gt 2 5E 6 1 0E 03 2 setting 5 full scale 14 setting 10 full scale 4 75 6 25 of full scale DC to 100 MHz 2 50 5 50 of full scale 100 MHz to 200 MHz 5 00 16 00 of full scale gt 200 MHz 3 00 4 50 of full scale DC to 100 MHz 2 00 3 50 of full scale 100 MHz to 200 MHz 3 25 12 00
5. Waveform Post trigger acquisition corresponds to an acquisition where the desired waveform window view is after the trigger event as shown in figure 1 Post trigger acquisition is limited to a maximum delay of 655 seconds but the trigger jitter will be improved when the trigger event falls within the memory window The memory window is limited by the maximum sample points at the selected sample rate 0004 000058 13 Pre Trigger Waveform Pre trigger acquisition corresponds to an acquisition where the desired waveform window view is before the trigger event as shown in figure 1 Pre trigger acquisition is limited by the maximum sample points at the selected sample rate Trigger and Arm Controls Trigger A and B Figure 2 depicts the trigger block diagram for the ZT1428VXI RT The holdoff by time and event counting functionalities are complete and independent for both trigger A and B Figure 2 Trigger Block Diagram Analog Trigger Emulation The ZT1428VXl uses a synchronous latch to qualify trigger events Enhancements to the ZT1428VXI RT enable a faster clock rate for the trigger latch circuitry The fast trigger clock rate improves the trigger detection for short or intermittent pulsed waveforms The trigger clock rates are listed in the specifications for each of the requested sample rates Function Controls Time Domain Transform This enables a low pass filter or Time Domain Transform on a waveform The digit
6. of full scale gt 200 MHz 0004 000058 31 Sensitivity of full scale 10 V Range 30 MHz Filter 50 ohm 14 00 12 00 10 00 O BR e Series 1 6 00 4 00 2 00 0 00 o 9 D es s S OP e e g Ss Sg RS x x x x ZF S E S x P K Si N SES Vv Frequency Hz BI 0004 000058 Default Reset Conditions Parameter Default Trigger B Disable Trigger B Events 4 Trigger B Holdoff 40E 9 seconds Function Transform Points 40 Acquisition Points 500 Acquisition Type Normal System Advanced Mode 1 now a constant Timebase Delay 0 Timebase Interval 2E 6 seconds Timebase Range 1E 3 seconds Timebase Reference Center Timebase Sample Real time 0004 000058 33 Error Codes 3 The following table lists the error codes No error codes have been added or removed to support the ZT1428VXI RT Description 34 0004 000058 0004 000058 35 Commands Index The following is an alphabetic list of the additional or modified commands and queries IEEE 488 Common Commands Name Command Syntax Identification Query IDN Instrument Specific Commands 36 Name Command Syntax Acquisition Points Command Query ACQuire POINts lt points gt Acquisition Type Command Query Function Transform Time Command ACQuir
7. to qualify a waveform capture based upon a specified number of trigger events The number of events can range from 1 to 65535 Trigger A hold off can be used with EDGE PATTern STATe or TV trigger modes Command Syntax TRIGger A EVENt lt event gt Query Syntax TRIGger A EVENt gt lt event gt Parameters Name Type Range lt event gt U16 1 to 65535 MINimum 1 MAXimum 65535 Sets or queries the duration in seconds to hold off or ignore all other triggers before recognizing the next trigger A event Command Syntax TRIGger A HOLDoff lt seconds gt Query Syntax TRIGger A HOLDoff gt lt seconds gt Parameters Trigger A Parameters Name Type Range lt seconds gt Float 40 ns to 320 ms MINimum 40 ns MAXimum 320 ms Resolution see table below Resolution Resolution Time in Seconds 10ns 40 ns to 655 36 us 100 ns 655 36 us to 6 5536 ms 1 us 6 5536 ms to 65 536 ms 10 us 65 536 ms to 320 ms 0004 000058 27 Name Description Trigger B Event Count Command Trigger B Event Count Query The TRIG B EVEN command is used to set the trigger B hold off value in number of events Event counting allows the trigger circuit to qualify a waveform capture based upon a specified number of trigger events The number of events can range from 1 to 65535 Trigger B events occur after a qualified trigger A event Trigger B hold off can be used
8. to reliably ground to the work surface The cuff must make electrical contact directly with the skin do NOT wear it over clothing Note Resistance between the skin and the work surface is typically 250 kilo Ohms to 1 mega Ohm using a commercially available personnel grounding device Avoid circumstances that are likely to produce static charges such as wearing clothes of synthetic material sitting on a plastic covered stool especially when wearing woolen material combing the hair or making extensive pencil erasures These circumstances are most significant when the air is dry When testing static sensitive devices ensure DC power is ON before during and after application of test signals Ensure all pertinent voltages are switched OFF while circuit boards or components are removed or inserted 4 0004 000058 Revision History Rev Date Section Description 1 12 15 2006 All Initial Release 1A 3 4 2007 Specifications Updated Input Trigger sensitivity specifications 0004 000058 0004 000058 Table of Contents MATEO OU CUO UN EE 11 DESEHPLION ss einen 11 PUNCUO ML E 13 SWEGD COMMONS EE 13 Sweep Reference Scenarios AEN 13 A Window Rue e L EE 12 POSt Trigger WM 12 Pre Trigger Waveform EE 14 Trigger and Arm Eed 14 Trigger A ad KE 14 Analog Trigger Emulation BEE 14 leet EE 14 Time Domain Transform deiere regeert ala 14 Measurement COMMONS sri snc tease eluate a e 15 Invalid Measurem
9. with EDGE trigger mode Command Syntax TRIGger B EVENt lt event gt Query Syntax TRIGger B EVENt gt lt event gt Parameters Name Type Range lt event gt U16 1 to 65535 MINimum 1 MAXimum 65535 28 0004 000058 Name Description Trigger B Hold Off Command Trigger B Hold Off Query Sets or queries the time duration in seconds after a qualified trigger A event to hold off before recognizing a valid trigger B event Command Syntax TRIGger B HOLDoff lt seconds gt Query Syntax TRIGger B HOLDoff gt lt seconds gt Parameters Name Type Range lt seconds gt Float 0 to 655mseconds MINimum Os MAXimum 655s Resolution see table below Resolution Resolution Time in Seconds 10 ns O to 655 36 us 100 ns 655 36 us to 6 5536 ms 1 us 6 5536 ms to 65 536 ms 10 us 65 536 ms to 655 36 ms 100 us 655 36 ms to 6 5536s 1 ms 6 5536s to 65 536s 10 ms 65 536s to 655s 0004 000058 29 Specifications Analog to Digital Converter Real Time Sample Rate 1 S s to 1 GS s 1 2 5 5 steps Interpolated Sample Rate 2 5 GS s to 50 GS s 1 2 5 5 steps and 2 0 GS s Equivalent time Sample Rate 2 5 GS s to 50 GS s 1 2 5 5 steps and 2 0 GS s Waveform Memory Maximum Samples per Channel Sample Rate S s Memory Samples 1 0E 0 12 5E 3 2
10. al filter algorithm uses a second order Infinite Impulse Response IIR filter The number of filter length data points range of 3 to 40 used to calculate the Time Domain Transform can be adjusted A higher filter length point number causes a lower cutoff frequency for the filter 14 0004 000058 Measurement Controls Invalid Measurement Reporting Instead of returning an invalid measurement value of 9 9999E 37 in the event of any clipped or over voltage waveform the ZT1428VXI RT will return the actual measurement results and set status bits in a status register to indicate the invalid or questionable measurement The cases that cannot perform the measurement will continue to return 9 9999E 37 All measurements will have the following reporting 16 bit status register An additional query MEASure VALid will be added to support the read back of the status valid of the last measurement queried Measurement Valid Bit Status Definition Description Measure Valid Bit Error bit mask definition Value Bit 0 Waveform not yet captured Bit 1 Waveform Overvoltage High Bit 2 Waveform Overvoltage Low Bit 3 selected Edge s not found Bit 4 15 Unused 0004 000058 15 16 0004 000058 Command Interface J Introduction IEEE 488 2 commands that are different or unique to the ZT1428VXI RT are presented in an alphabetic list below See the ZT1428VXI Manual for all other commands IEEE 488 2 Common Commands Name Desc
11. auses a lower cutoff frequency for the filter Command Syntax FUNCtion lt n gt TRANsform TIME POINts lt points gt Query Syntax FUNCtion lt n gt TRANsform TIME POINts gt lt points gt Parameters Name Type Range lt n gt U16 1 Function Channel 1 2 Function Channel 2 3 to 40 points MINimum 3 MAXimum 40 lt points gt U16 Measure Valid Query Queries the measurement valid register The measurement valid register consists of 5 bits each indicating a possible issue with the last measurement requested After a Measurement is requested the user can query the measurement valid status to identify if any of the following conditions could affect the measurement Only the conditions that could affect a particular measurement will be reported in the query Query Syntax MEASure VALid gt lt valid gt Parameters Name Type Range lt valid gt U16 Bit 0 Invalid Waveform Bit 1 Wave Clipped High Bit 2 Wave Clipped Low Bit 3 Edge not found Bit 4 15 Unused 20 0004 000058 Name Description System Advanced Mode Command System Advanced Mode Query System advanced mode is permanently enabled for the ZT1428VXI RT configuration The ZT1428VXI RT will accept the command but it will have no effect The advanced mode query will always return 1 Command Syntax SYSTem ADVanced lt mode gt Query Syntax SYSTem ADVanced
12. e TYPE lt mode gt FUNC lt n gt TRAN TIME lt source gt Function Transform Time Points Command Query Measure Valid Query FUNC lt n gt TRAN TIME POIN lt points gt MEASure VALid gt lt valid gt System Advanced Mode Command Query Timebase Delay Command Query SYSTem ADVanced lt mode gt TlMebase DELay lt time gt Timebase Interval Command Query Timebase Range Command Query TlMebase INTerval lt interval gt TlMebase RANGe lt range gt Timebase Reference Command Query TlMebase REFerence lt points gt Timebase Sample Command Query TlMebase SAMPle lt value gt Trigger A Event Count Command Query TRIGger A EVENt lt event gt Trigger A Hold Off Command Query TRIGger A HOLDoff lt seconds gt Trigger B Event Count Command Query TRIGger B EVENt lt event gt Trigger B Hold Off Command Query TRIGger B HOLDoff lt seconds gt 0004 000058 ZTEC Instruments 0004 000058 37
13. ent Reporting uussmernesssnnnnannnnnnnnnnnnnnnannn 15 Introdu lion EE 17 IEEE 488 2 Common EENS 17 Identification Query EE 17 IBIN ate raid E EAS 17 COMP Commands and Queries ET 18 Acquisition Points Command EE 18 Acq isition PONS QUETY ion E 18 Acquisition Type Comic 18 ACQUISITION TYPO QUETY casonas een 18 Function Transform Time Commande 19 Function Transform Time Points Commande 20 Function Transform Time Points Ouer 20 Measure Valid Query E 20 System Advanced Mode Command AAA 21 System Advanced Mode Query iii 21 Timebase Delay Command 22 Timebase Delay Query aa ee 22 Timebase Interval Commande 23 Timebase Interval Query ENEE 23 Timebase Range Commande 24 Timebase Range Query EE 24 Timebase Reference Command uk 25 Timebase Reference Query asi ker 25 Timebase Sample Commande 26 Timebase Sample Query ne 26 Trigger A Event Count Commande 27 Trigger A Event Count Query anne Gea ole 27 Trigger A Hold Off Commande 27 Trigger A Hold Off Queen ee 27 Trigger B Event Count Command ie 28 Trigger B eege EE 28 Trigger B Hold Off Command sss a 29 Trigger B Hold Off Query Be 29 0004 000058 7 Specifications a adecccacnceeas estes Genes saugscesecadtucstedcatasasneadsteaceteanctctausaatusoaeuettensineans cagesebeetsaccisceeceteseas 30 als gi eB e E PP 30 Waveform Memory as 30 Tagen ae ee ee 31 10 V Range 30 MHz Filter 50 ohm
14. gt lt mode gt Parameters Name Type Range lt Mode U16 1 ON gt 0004 000058 21 Name Description Timebase Delay Command Timebase Delay Query The time base delay command is used to set the time interval between the trigger event and the active point The delay reference point is set to waveform delay reference the left center or right of the active waveform using the TIMebase REFerence command e Entering Time When 0 is entered the trigger event occurs at the delay reference point Positive values set the trigger event to occur before the delay reference point to capture post trigger events Negative values set the trigger event to occur after the delay reference point to capture pre trigger events The range of acceptable DELay values is dependent on the current TIMebase RANGe setting If DELay is set to a value outside the allowable range it will automatically be set to the nearest acceptable value without generating an error Note The Acquisition Points Timebase interval Timebase Range and Timebase Delay are all interrelated Any time one of these settings is entered the Acquisition Points will be coerced to the maximum points available at the setting desired An error will be generated in the case the points are coerced The Timebase Delay may also be coerced but it will not generate an error The desired setting order should be as follows Timebase Interval or Timebase range f
15. iption Timebase Range Command Timebase Range Query The time base range command is used to define the full scale horizontal axis or X axis of the main sweep This time base range is specified for a 500 point waveform even if the waveform size is not set to 500 points e Entering Range Range values are entered in a 1 2 5 sequence If a value is entered that is not in a 1 2 5 sequence it is automatically rounded to the closest allowable value without generating an error e Effects on other timebase selections A change in the range parameter may affect the current settings specified for TlMebase DELay The timebase range query returns a numeric value representing the current range setting for the horizontal axis The value in seconds corresponds to the time for a 500 point waveform even if the waveform size is not set to 500 points Note The Acquisition Points Timebase interval Timebase Range and Timebase Delay are all interrelated Any time one of these settings is entered the Acquisition Points will be coerced to the maximum points available at the setting desired An error will be generated in the case the points are coerced The Timebase Delay may also be coerced but it will not generate an error The desired setting order should be as follows Timebase Interval or Timebase range followed by Acquisition Points and the Timebase Delay Command Syntax TlMebase RANGe lt range gt Query Syntax TlMebase RANGe
16. lete data record to be collected or captured on one trigger event REPetitive sample mode accumulates a complete data record over one or more trigger events e When in the repetitive mode the acquisition points value must be 500 When in the real time mode acceptable acquisition points values are adjustable between 100 points and the maximum number of samples for the selected sample rate See the Acquisition Points command for more details e The timebase sample mode is related to the acquisition type When in the real time mode the acquisition type must be NORMal When in repetitive mode the acquisition type may be NORMal AVERage or ENVelope NORMal repetitive mode allows high sample rate reconstruction using many acquisitions and is also referred to as equivalent time sampling The number of acquisitions used to reconstruct the waveform is defined with the ACQuire COUNt command See the Acquisition Type command for more details Command Syntax TlMebase SAMPle lt mode gt Query Syntax TIMebase SAMPle gt lt mode gt Parameters Name Type Range lt mode gt Discrete Realtime REPetative 26 0004 000058 Name Description Trigger A Event Count Command Trigger A Event Count Query Trigger A Hold Off Command Trigger A Hold Off Query The TRIG A EVEN command is used to set the trigger A hold off value in number of events Event counting allows the trigger circuit
17. oint o ENVelope Used when measuring voltage or time jitter in repetitive timebase sampling mode The waveform reflects the minimum and maximum values for each sample point The Acquire Type query returns the currently selected acquisition type Command Syntax ACQuire TYPE lt mode gt Query Syntax ACQuire TYPE Parameters Name Type Range lt mode gt Discrete NORMal AVERage ENVelope Function Transform Time Command Sets the instrument to perform a time transform on a waveform using a waveform math function channel The time transform performs a second order IIR low pass filter operation on the data Command Syntax FUNCtion lt n gt TRANsform TIME lt source gt Query Syntax None Parameters Name Type Range lt n gt U16 1 Function Channel 1 2 Function Channel 2 lt source gt Discrete CHANnel lt n gt Input channels where lt n gt may be 1 or 2 Example CHAN1 WMEMory lt n gt Waveform memory channels where lt n gt may be 1 2 3 or 4 Example WMEM1 FUNCtion lt n gt Function channels where lt n gt may be 1 or 2 Example FUNC1 0004 000058 19 Name Description Function Transform Time Points Command Function Transform Time Points Query Sets or queries the number of filter length points used to calculate the Time Transform within a waveform math function channel A higher filter length point number c
18. ollowed by Acquisition Points and the Timebase Delay Command Syntax TIMebase DELay lt time gt Query Syntax TlMebase DELay gt lt time gt Parameters Name Type Range lt time gt Float Dependant on TlMbase RANGe 22 0004 000058 Name Description Timebase Interval Command Timebase Interval Query The time base interval command selects the sampling interval for the instrument in seconds The sample rate in samples per second can be calculated as the reciprocal of this sampling interval Note The Acquisition Points Timebase interval Timebase Range and Timebase Delay are all interrelated Any time one of these settings is entered the Acquisition Points will be coerced to the maximum points available at the setting desired An error will be generated in the case the points are coerced The Timebase Delay may also be coerced but it will not generate an error The desired setting order should be as follows Timebase Interval or Timebase range followed by Acquisition Points and the Timebase Delay Command Syntax TiMebase INTerval lt interval gt Query Syntax TlMebase INTerval gt lt interval gt Parameters Name Type Range lt interval gt Float 20 ps to 1s with 1 2 4 sequence non exact values are rounded down Additional interval of 500ps available MINimum 20ps MAXimum 1s 0004 000058 23 Name Descr
19. owed by Acquisition Points and the Timebase Delay Command Syntax ACQuire POINts lt points gt Query Syntax ACQuire POINts lt points gt Parameters Name Type Range lt points gt U32 100 to Maximum Samples See Specifications for Maximum Samples per channel The Acquire Type command selects the type of waveform that will be acquired In real time sampling mode the instrument must use NORMal acquisition In repetitive sampling mode all three acquisition types are available In repetitive timebase sampling mode the number of acquisitions used to create the waveform is defined with the ACQuire COUNt command See the Timebase Sample command for more details on selecting real time or repetitive sampling o NORMal In real time sampling mode normal acquisition enables the capture of an entire waveform with each acquisition In repetitive sampling mode normal acquisition enables a high sample rate reconstruction over multiple acquisitions also referred to as equivalent time sampling In equivalent time sampling each point in the waveform reflects a data point hit in a time bucket between the sampling clock interval 18 0004 000058 Name Description o AVERage Used when reduction of signal noise and improved resolution are desired in repetitive timebase sampling mode The waveform reflects multiple acquisitions averaged to form a combined waveform of averaged values for each sample p
20. ription Identification Query The identification query returns the instruments identification IDN information The response contains four fields separated by commas in the form ZTEC ZT1428VXI RT serial number firmware revision level Command Syntax None Query Syntax IDN Parameters lt id string gt Descriptions Identification String Value See above 0004 000058 17 COMP Commands and Queries COMP language commands that are different or unique to the ZT1428VXI RT are presented in an alphabetic list below See the ZT1428VXI Manual for all other commands Each command parameter table includes parameter name parameter type and range of values Name Description Acquisition Points Command Acquisition Points Query Acquisition Type Command Acquisition Type Query The acquisition points command selects the number of samples for each acquisition record The maximum number of sample points varies with the selected sample rates Note The Acquisition Points Timebase interval Timebase Range and Timebase Delay are all interrelated Any time one of these settings is entered the Acquisition Points will be coerced to the maximum points available at the setting desired An error will be generated in the case the points are coerced The Timebase Delay may also be coerced but it will not generate an error The desired setting order should be as follows Timebase Interval or Timebase range foll
21. tional Instruments Corporation Windows Microsoft Corporation The material in this manual is for informational purposes only and is subject to change without notice ZTEC Instruments Inc assumes no responsibility for any error or for consequential damages that may result from the use or misinterpretation of any of the procedures in this publication 0004 000058 Handling Precautions for Electronic Devices Subject to Damage by Static Electricity This instrument is susceptible to Electronic Static Discharge ESD damage When transporting place the instrument or module in conductive anti static envelopes or carriers Open only at an ESD approved work surface An ESD safe work surface is defined as follows e The work surface must be conductive and reliably connected to an earth ground with a safety resistance of approximately 250 kilo Ohms e The surface must NOT be metal A resistance of 30 300 kilo Ohms per square inch is suggested Ground the frame of any line powered equipment chassis test instruments lamps soldering irons etc directly to the earth ground To avoid shorting out the safety resistance ensure that the grounded equipment has rubber feet or other means of insulation from the work surface Avoid placing tools or electrical parts on insulators Do NOT use any hand tool that can generate a static charge such as a non conductive plunger type solder sucker Use a conductive strap or cable with a wrist cuff
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