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Mitech MFD350 User Manual

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1. 2 1 i oy EC Se E oe Si D e La Ee EY p A b el E td El ee D D K d a d Sr bebe d ci 68 1 Belt 2 LCD Display 3 LOGO 4 Function Keys 5 Menu Keys 6 Alarm LED 7 Power LED 8 Keypad 9 Rotary Knob 10 Product Label 11 Support Pillar Screw 12 Battery Case 13 Power adapter port 14 Battery Switch 15 USB Socket 16 Probe Cable Port Transmit 17 Probe Cable Port Receive 7 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com 2 2 Screen Display The instrument displays are designed to be easy to interpret 44 0 TEES Reject TE 2 5P28 8 Probe p raaa Wave file ke eene LC BASIC P R GATE MEM CFG The Instrument has a digital screen for the display of A Scan Top figure shows the main screen H H dE 4246 7 op SDK EE RANGE The names of the menus orUti submenus are displayed at the Hugli VELOCITY 2 bottom of the screen The selected Ah ae ee eee ee 0926 menu or submenu is highlighted SEET EEN e Si Se Mech EE EEN A ABA aa ness AROS 350 0 S SW GAIN COMP B SCAN Indicated at the right of the display next to the A Scan are the functions hh ipinsinsenasfusfansfanafinajens of the corresponding menu The Se ee a 2424 display of the functions disappears i 2 2 2 3 on the home screen vibe a A DAD Awe SEE e P R CHE BO 3220m So 8 6 8 6 80 B DN 8
2. When complete press the function key corresponding to FINISH and follow the on screen prompts to finish the editing Creating DAC Offset Curves When operating with DAC turned on three DAC curves including RL SL and EL are typically displayed The three curves can be offset from the original DAC curve ML by a user inputted amount Select the function DAC RL or DAC SL DAC EL located in the OFFSET submenu Change the offset value by means of the knob RL IT The offset range from 50dB to 50dB Do HAD AADAT CHAI 245 0 3250 5 if RI Ac 156 68 36 6 6 6 6 6d06 Specifying the DAC Reference Curve Once the DAC curve is recorded and displayed by turning DAC DISP on echoes are automatically compared to the size reference curve which can be specified in the SIZE REF selection The options include RL SL EL and ML The dB equivalent height of the signal above or below the corresponding DAC Reference Curve amplitude is displayed as a comparison result 33 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com The comparison result is shown as right figure Wi Current Gate Note that the result is like RL 3 9 eg get ve test J CSG EC sate pat eg H IL D S 1 V U Hal 458 L37Dmeg SES D J Ob Deleting a DAC Curve To delete a stored DAC curve With the DAC menu activated select the DEL submenu Press the f
3. NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com starting at a later point This allows you to shift the complete screen display and consequently also the display zero If the display should for example start from the surface of the test object the value in D DELAY must be set to 0 To set the display delay Activate the BASE submenu located in the BASIC menu by pressing the menu key below it Three functions will appear down the right side of the display screen Press the function key next to the selection titled D DELAY To change the display delay turn the knob You ll note that the displayed echoes shift to the left or right Range 20 3400 us Coarse adjustment 10 pixel space in us Fine adjustment 1 pixel space in us 4 4 Selecting Probe Test Mode You can use the function PRB MODE to activate the pulser receiver separation The following modes are available SINGLE For single element operation will be displayed the probe connection sockets are connected in parallel DUAL For the use with dual element TR probes will be displayed the right hand socket is connected with the amplifier input whereas the initial pulse is available at the left hand socket THRU _ Through transmission mode for the use with two single element probes will be displayed the receiver is connected with right the pulser is connected with lef
4. eMail sales NDTzone com Web www NDTzone com Setting a Gate s Threshold Vertical Position You can determine the threshold value of the gates within the range of 0 to 99 screen height for triggering the LED alarm if this value is exceeded or not reached depending on the setting of the LOGIC function Activate the GATE submenu located in the GATE menu Select the gate to be positioned using the GATE SEL function Select the THRESH function and adjust the vertical height by turning the knob Increasing and decreasing the value of the threshold moves the gate up and down respectively Defining B Gate Alarm Logic This function allows you to choose the method for triggering the B Gate alarm Gate alarms can be set to trigger when an A Scan echo crosses the gate POSITIVE logic or when no echo crosses the gate NEGATIVE logic within the displayed range A Gate is locked to POSITIVE logic And 8S B Gate can be set to either POSITIVE orl NEGATIVE e EISE SC The appearance is different between the POSITIVE gate and the NEGATIVE gate when displayed This is shown in right figures Ai IO Note that the alarm and measurement n function of the gates is only active within the display range Use the following procedure to specify B Gate logic Activate the LOGIC submenu located in the GATE menu by pressing the menu key below it Select the LOGIC function and choose the gate alarm triggering Sa EE ut Za l
5. NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com The measurement line below the wave display shows values of range ue 461 3 m settings and measured values eee eee ee ee i n Amplitude height sw Sound path ui Projection Depth e Ax61 3 means gate mode is single Li pees selected gate is gate A and peak D DELAY echo position sound path 61 3 mm H HUH AB 24 0 means Echo Echo mode selected gate is gate A soundpath 24 0 mm The setting line below mellt RANGE m measurement line shows the channel ui file name the beam angle the Lien KAREAR velocity and the gain x EENT 5924 The status area at the bottom right corner shows the system status The following status will be showed H Indicates the battery capacity Straight beam probe 1 Angle beam probe H Single element probe k Dual element probe RM Through transmit mode 7 Pog tek a ere eee fas cae one La OR Peak hold function on SA USB online A Scan freezed Do H G L A w l of 700A CHOG 800 5920mr2 250 0 0 0 09E mi The echo position area at the top right corner indicated shows the projection and the depth of the peak echo NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com 2 3 Keys and Rotary Knob Features The instrument is designed to give
6. 4 19 Setting the Angle of Incidence eee cecccceecceceeeeeeeeeeeeeeeeeeeeesaaees 4 20 Magnifying the Contents Of a Gate 4 21 Freezing the A Scan Display 422 Setting the Display Grid EEN 4 23 Sel CCUM D ur EE APG SCAG Oe e WEE AZO ll LUM CHO DEE 4 26 Setting the Display Brightness cccccssccccsseecseeeeesaseessenseseaaees 4 27 Setting the Display Color sssri ailai 428 Setting ele B29 KO Y SOUNA E 4 30 Dale and Time nl e EE 4 31 Display the System Information ccccccccccceecceeeeeeeseeeesseseeeseeees 4 32 Resetting the Instrument 4 33 Connecting to A COMPUTES ccc ecccceseeceeseeeeeeseeseeeseeaeeeeaeeeeeesaes 5 Calibration and Measurement ere eLERE REPT EN TERE EET PERCE Tee ETE TEETER ERI TCT REE Re Eee 5 1 Calibration with Straight and Angle Beam Probes sonnoenneennennnnn 2 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com 5 2 Calibration with Dual Element TR Probes soennennneneennnnnnennennennns 30 5 3 Distance Amplitude GUNE seia e 32 5 4 Measuring With AV G AV EEN 34 99 GUnVved SUraCe COMeCHOM dee e 37 ER lAW SIZING BEE 37 5 7 Crack Height Measuring Feature nnnnnnnnennnennennnnnennnrnnrnnnnsnnresennn 38 5 0 Envelope FUNCT e 38 E Ca HOI ET EE 39 SOB SC ail EE 39 SDAA ONG NG EE 40 6 Maintenance and Care Te Te Ce TT TT eT eT TET eS TET Eee eT eee Sea ee err 42 6 1 Gareofthelns
7. BSCAN DIR PDELAY P DELAY DAMPING ENERGY P WIDTH PRB MODE LOGIC RECTIFY REJECT FUNC XTL FREQ EFF DIAM X VALUE SIZE S REF1 S REF2 ANGLE CRACK HL DIAM HL DEPTH CAL GATE SEL GATE MODE B LOGIC ALARM ENVELOPE HEIGHT A POINT B POINT 45 RECALL CLEAR CHANNELS WAVES VIDEOS SYS RESET FILL BRIGHT SYS COLOR WAV COLOR VERSION S N NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com E Sal ae PROGRAM AVG RECORD eee et FINISH EDIT REF ADJUST DELETE FINISH DAC RL OFF SET DAC SL DAC EL SIZE REF DELDAC DEL E ooo DAC DISP DISP PROGRAM RECORD ADJUST FINISH XTL FREQ EFF DIAM REF TYPE REF SIZE AVG UL AVG ML AVG DL DEL AVG AVG DISP
8. gate width equals the full screen width The display will contain the magnified view until pressing again Mu D DU D A614 63 5 Ad floes Awol m 1540 CHA zaet 5920m 79 0 0 0 0 AdE CHEE 887 Dim es 23 6 6 0 6 8d6 Before Magnifying After Magnifying 4 21 Freezing the A Scan Display Whenever an A Scan is active pressing freezes the A Scan display The active A Scan will remain as it appeared when was pressed and the display will remain frozen until is pressed again 4 22 Setting the Display Grid Activate the SYS submenu located in the CFG menu by pressing the menu key below it Three functions will appear down the right side of the display screen Press the function key next to the selection titled GRID To change the grid type continue pressing the function key or turn the knob Each grid style is shown in the display screen s A Scan window as 24 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com it is selected You ll note that the following styles are available G1 Ten major horizontal and five vertical divisions G2 Two major horizontal and vertical divisions G8 No on screen grid Only display edge marks are visible The grid style will be set to the last one displayed 4 23 Selecting Units In the function UNITS you can choose your favorite units between mm or inch Activate the SYS submenu located in
9. mains The instrument automatically shuts off when batteries are too weak for reliable operation Settings are saved and restored when the instrument is turned on again You can charge the lithium ion battery pack either directly in the instrument or by means of an external battery charger provided with the instrument Attention You should only use the batteries provided by us and the corresponding battery charger An improper handing of the batteries and of the battery charger may cause explosion hazard Internal Charging Check the battery switch on the top of the instrument Make sure to switch it on before internal charging If a battery pack is located in the instrument the charging process is started automatically when you connect the plug in power supply unit You can carry out ultrasonic inspections and charge a battery at the same time The charging time is 10 hours with a simultaneous ultrasonic inspection If the instrument is not being used for ultrasonic inspections the charging time is 8 hours This charging time applies to ambient temperatures from 25 to 30 C Please take into consideration that the batteries are not charged to their full capacity at higher temperatures The PWR LED display at the top right corner of the keypad indicates the status of the charging process It will flash red green during the charging process And the flash will stop when the charging process stops External Charging Lithium ion batteri
10. Offset Curves When operating with AVG turned on three AVG curves including the AVG UL the AVG ML and the AVG DL are typically displayed The three curves can be offset by user inputted equivalent flaw size values in the AVG UL AVG ML and AVG DL selection The offset values will usually depend on the largest acceptable flaw size Deleting AVG Curve To delete stored AVG curve With the AVG menu activated select the DEL submenu Press the function key next to the DEL AVG function Press the function key next to the DEL AVG function a second time or turn the knob Then follow the on screen prompts to confirm the deleting Turning On Off the AVG display Turning the AVG DISP On and Off causes the AVG curve to be displayed or removed With the AVG menu activated select the DISP submenu Press the function key next to the AVG DISP function Press the function key next to the AVG DISP function a second time or turn the knob to turn On Off the AVG display Note that if the AVG curve is not created it will prompt out No AVG curve found and AVG DISP 36 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com value will be OFF Also note that switching this value to OFF does not delete the curve it simply removes the curve from the display and disables the AVG mode Evaluating Test Samples in AVG Mode Once the curve is recorded and displayed by
11. Setting a Gate s Starting Point You can fix the starting point of the gates A or B within the display range Activate the GATE submenu located in the GATE menu Select the gate to be positioned using the GATE SEL function Select the gate START function and adjust the starting point by turning the knob Increasing and decreasing the value of the starting point moves the gate to the right and left respectively The gate starting point will remain as set even when width adjustment is made Coarse adjustment 10 pixel space Fine adjustment 1 pixel space When the gate exceeds the display range as shown in right figure the measured value will be shown as in the measurement line LEJ d d e d ph SS mt SC CHES saat Zimmer You can also set the selected gate s starting point using the Quik Search Function Quick Search Function is achieved by simply pressing the Ci and B Note that the instrument will only search the echo whose peak crosses the selected gate in this function Adjusting a Gate s Width You can determine the gate width within the display range Activate the GATE submenu located in the GATE menu Select the gate to be positioned using the GATE SEL function Select the gate WIDTH function and adjust its value by turning the knob Coarse adjustment 10 pixel space Fine adjustment 1 pixel space 20 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243
12. the CFG menu by pressing the menu key below it Three functions will appear down the right side of the display screen Press the function key next to the selection titled UNITS You ll note that the following options are available METRIC metric unit system IMPERIAL Imperial unit system To change the units of measurements repeatedly pressing the corresponding function key or by means of the knob The unit of measurement will be set to the choice last displayed 4 24 Scale Setting As an alternative to the measured values the instrument enables to display a scale in the measurement line The scale gives you an overview of the position of echoes You have a choice between a dimensionless ten division scale and a scale showing the real position of the echoes The following settings are possible S PATH Display of sound path scale P D Display of projection distance mu scale DEPTH Display of depth distance scale DIV Display of a dimensionless scale RANGE Display of Range scale Select the function SCALE Then use the knob to set the required display mode As an alternative you can repeatedly press to switch the scale 4 25 Fill function The function FILL toggles between the filled and the normal echo display mode The filled echo display mode improves the echo perceptibility due to the strong contrast especially in cases where workpieces are scanned more quickly 25 NDTzone Non Destructive Testi
13. the asterisk preceding the file name is no longer there Channel Files Channel files CHOO CH99 are used to store a specific instrument setup configuration This means that whenever you recall a stored channel file your instrument is again set up exactly the same as it was at the moment when the file was stored This makes each one of your tests reproducible You will find the following functions Channel STORE To store instrument settings in a channel file follow this procedure 40 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com Activate the CHANNEL submenu located in the MEM menu by pressing the menu key below it Press the function key next to the selection titled FILE Then change the file name to the one you desire by turning the knob Note that if the file is no empty an icon of will appear before the file name and data can t be saved to this file Press the function key next to the selection titled STORE Perform the store operation by pressing the function key once more or turning the knob If the store operation is successful it will prompt out Data saved Note that if the channel file is not empty the store operation will be canceled and prompt out a message Error This channel is not empty You should change the FILE to an empty file to store the instrument settings Channel RECALL When the channel file is reca
14. the user quick access to all of the Instrument e functions lts easy to use menu system allows any function to be accessed with no more than three key presses To access any function Press one of the five menu keys F1 F5 to select a menu The menus across the bottom of the display will immediately be replaced with the submenus contained in the selected menu Press a menu key F1 F5 again to select the submenu containing the desired function Up to four functions will be displayed in the function bar on the right side of the display Select the desired function by pressing one of the four function keys S1 S4 Change the value listed in the function box with the rotary knob Some values can also be adjusted with repeatedly pressing the corresponding function key Special keys such as Gain BCE Gate Range Probe Zero Offset Jo Calibration Angle Calibration Freeze Save Waveform p AE Auto Gain Envelop Peak Hold 2 m and etc are grouped together for easy thumb control This ah ere design allows direct access to important instrument set up Ultrasonic parameters and provides easy Flaw Detector and fast operating in difficult inspection environments la Home key immediately returns the instrument to the main screen Freeze key freezes the A Scan ES Magnify key expands the gate range to full screen Alarm key turns the gate alarm on or off For turning the instr
15. the year month or days turn the knob while the desired item is highlighted When complete press the function one more time The current date will be set to the date displayed Time is displayed in Hour Minute format And the time setting procedure is similar to that of the date Once set the internal clock of the instrument will maintain the current date and time 4 31 Display the System Information You can enter the INFO submenu to see the software version and the serial number of the instrument The VERSION and the S N values are read only They cannot be modified by the user 4 32 Resetting the Instrument In case the instrument can no longer be operated or you need to make a basic initialization factory setting you can reset the instrument The instrument can be reset by the SYS RESET function All the memory data including the wave files the channel files and the video files will be cleared during system reset And the instrument settings will be reset to default To reset the instrument Activate the RESET submenu in the MEM menu by pressing the menu key below it Press the function key next to the SYS RESET function Continue pressing the function key or turn the knob to trigger the reset 2 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com action It will prompt out Reset system to original Press the menu key belo
16. turning AVG DISP on echoes are automatically compared to the AVG curve and evaluated based on the recorded reference The result is shown as ERS Equivalent Reflector Size which evaluates the reflected echo and calculates the equivalent reflector size This is shown in right figure Note that the ERS is 2 1 mm 5 5 Curved Surface Correction pistanc When using angle beam Flaw Depth Eege transducers on a curved Surface the instrument will calculate the surface distance and depth of defect taking into Outside account the internal or external radius Inside THICKNESS THICK Use the THICK function to set the materials wall thickness This value is required for the automatic calculation of the real depth Adjustment range 10 5000 mm O DIAM Outside diameter of the test object You will need the CSC function for tests on circular curved surfaces for example when testing longitudinally welded tubes In order to make the instrument carry out the corresponding correction of reduced projection distance and depth you should enter the outside diameter of your test object in this function Adjustment range 2 5000 mm CSC If you plan to carry out the flaw position calculation for the curved surface workpieces the CSC function should be turned on Otherwise turn off the CSC function 5 6 Flaw Sizing Feature Using the Flaw Sizing feature you can calculate the equivalent size of the flaw 37 NDTzone Non Dest
17. with equally sized reflectors holes located at various material depths The primary echo from each of these points for up to a total of 16 echoes are recorded When DAC is active the instrument displays a curve that represents echo peaks for constant reflectors at varying material depth Before starting to record a reference curve the instrument must be correctly calibrated To program the DAC Curve Access the DAC menu by pressing is then select the DAC submenu by pressing the menu key below it Press the function key next to the PROGRAM function Repeatedly press the PROGRAM function key or turn the knob to Trigger the DAC program When DAC program is triggered DAC and a digit number indicating the point index appears on the top right corner of the display Couple the probe to the first reference point and adjust the gate so that it is broken by the primary echo If necessary adjust the gain so that the echo crosses the gate and the highest peak in the gate is at approximately 80 of full screen height The highest peak must not be higher than 100 full screen height Note that you can press G ort to search the next echo very quickly While the gate is lined up over the first reference echo press the key next to the RECORD function Continue to press the key next to the RECORD function to record the first DAC Curve point Note that the largest echo to cross the A Gate will be treated as the reference echo The gain value
18. with the instrument settings Data in the wave files can be stored recalled and erased Wave STORE You can save the A Scan pattern to a wave file using the STORE function Select the function FILE Use the knob to set the file name where you would want to store the current A Scan pattern FOOO F999 Select the function STORE Use the knob or repeatedly press the corresponding function key to trigger the STORE operation Note The asterisk before a selected file name indicates that this file is already occupied It is not possible to overwrite an occupied file select another file name which is still empty or clear the occupied file To avoid loss of data e g in case of a software update you should save the file to a PC Wave RECALL You can recall a stored wave file your instrument will then display all the test relevant technical features that existed at the moment of the setup A frozen display of the stored A Scan appears Wave CLEAR An occupied file is marked with an asterisk before the file name You can clear the file if you no longer need them Wave Files are cleared using the CLEAR function Select the function FILE Use the knob to set the file name to clear FOOO F999 Select the function CLEAR Use the knob or repeatedly press the corresponding function key to trigger the CLEAR operation It will then prompt Clear wave file Confirm by pressing the corresponding key one more time The file is now cleared
19. DTzone com ALRM LED PWR LED Battery charging Flash red green external power connected No battery installed No external power 12 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com 3 Initial Start up 3 1 Power Supply The instrument can be operated with an external power adapter or with batteries You can connect the instrument to the mains supply system even if it carries batteries A discharged battery is charged in this case viz parallel to the instrument operation Operation Using the Power Supply Unit Connect the instrument to the mains socket outlet using the power supply unit The plug receptacle is at the top left of the instrument Push the plug of the power supply unit into the plug receptacle until it snaps into place with a clearly audible click The PWR LED on the keypad of the instrument will light in green color if the connection is properly aligned Operation Using Batteries Use a lithium ion battery pack provided with the instrument for the battery operation The battery compartment is situated at the instrument back The lid is fastened with 4 attachment block To insert the battery pack Move the four attachment block of the battery compartment downward in order to loosen them Lift the lid off upward At the bottom of the battery compartment you will see two springs Insert the battery into the battery compartm
20. EE second calibration echo Ik a A a ACTION PULSER ROVER Press the function key next to the function CAL to carry out the calibration The valid calibration is briefly confirmed and carried out SS H Bwdoaa 3 TAGE Haa A Soeemes 74 0 0 0 0 AdE PULSER REVER J 5 2 Calibration with Dual Element TR Probes Dual element TR probes are especially used for wall thickness measurement The following peculiarities must be taken into account when using these probes 30 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com Echo Flank Most dual element TR probes have a roof angle transducer elements with inclined orientation toward the test surface This causes mode conversions both at beam index sound entry into the material and at the reflection from the backwall which can result in very jagged echoes V Path Error Dual element TR probes produce a v shaped sound path from the pulser via the reflection from the backwall to the receiver element This so called V path error affects the measuring accuracy You should therefore choose two wall thicknesses that cover the expected thickness measurement range for the calibration In this way the V path error can be corrected to the greatest possible extend Higher Material Velocity Due to the V path error a higher material velocity than that of the test material is given durin
21. MFD350 Ultrasonic Flaw Detector Operating Manual N Mitech Inc Ltd NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com Introduction ENEE Eege 1 1 Features of the Instrument EE ee Me al kee Instrument Package ransana Eege 2 Understanding the Keypad Menu System and Displays ee SEI E RRE EE 2 3 Keys and Rotary Knob Features c ccccceecceeeceeeeeeeeeesseeseeeeeseeeesees 24 Menus ANG UMC ei 2 PAVIA NIG IAS ag sede ce sn 2e 5 ates cia cetag ae nee asaGcanuacaaanes nese T taco tee eee 3 Initial Start UD EE Se TN elei E 8 2 GONMECTING A FOS EE 3 3 la Re dert unn E 4 Operation EE EE Seon 4 1 Adjusting the Display Range nnannnnnnnnannnannnnnnnnannnennnnnnnnnnnnnnennnnnn 4 2 Setting the Material Vlot cecnannen a e 4 3 Setting the Display Deia 4 4 Selecting Probe Test MOde erreneren a ees eivorss 4 5 Selecting a Rectification Mode 4 6 Setting the A Scan Reject Level 47 SOU the Galie 4 8 Changing the Gain Adjustment Increment DB GIE AO Alo RE Me BET 4 10 ge nde tie Le Bt 4 11 Setting the Damping Level 4 12 Setting the Pulse Energy Level 4 12 Seming NE PUISE WIEN EE 4 14 Adjusting the Pulse Repetition Frequency DE 4 15 Specifying the Probe Frequency cccccescecsseeccceeesseeeeseeeeesaaaes 4 16 Specifying the Piezo Crystal ze 4 17 Setting the Probe A Value serseri aR 4 189 Probe Delay e EE
22. Then record this position in the B POINT function The instrument will automatically calculate the crack height using the recorded parameters and displays the result in the HEIGHT bar 5 8 Envelope Function When within the Envelope function is activated the echoes with the highest amplitude selected gate will be recorded and displayed statically on the screen additionally to the live A Scan And the Ab icon will appear near the down right of the display 38 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com To activate the Envelope function eg oe TA O E s Activate the FUNC submenu hi located in the GATE menu by uch a4 pressing the menu key below it E E Press the function key next to 2 ee ere Aer pen function key or turn the knob HBG 2635 3230m 44 0 0 0 0 006 the selection titled ENVELOPE To turn on off the ENVELOPE ak aaa a function continue pressing the ae G r Also you can continue pressing to turn on off the Peak Hold function Note that Peak Hold and Envelop cannot function simultaneously 5 9 Peak Hold Feature echo with the highest amplitude in the EK ENEE T When Peak Hold is activated the c fpi ct ee ee ee mm TO selected gate becomes the reference BH OFF echo displayed statically on the neit screen additionally to the live A Scan E reer ere And the It icon will a
23. Two fully independent gates offer a range of measurement options for signal height or distance using peak triggering The echo to echo mode allows accurate gate positioning for signals which are extremely close together Gate Start Variable over entire displayed range Gate Width Variable from Gate Start to end of displayed range Gate Height Variable from 0 to 99 Full Screen Height Alarms Threshold positive negative Memory Memory of 100 channel files to store calibration set ups Memory of 1000 wave files to store A Scan patterns and instrument settings All the files can be stored recalled and cleared Functions Semiautomatic two point calibration Automated calibration of transducer zero offset and or material velocity Flaw Locating Live display Sound path Projection surface distance Depth Amplitude Flaw sizing Automatic flaw sizing using AVG AVG or DAC speeds reporting of defect acceptance or rejection Digital Readout and Trig Function Thickness Depth can be displayed in digital readout when using a normal probe and Peam path Surface Distance and Depth are directly displayed when angle probe is in use Both the DAC and the AVG method of amplitude evaluation are available Curved Surface Correction Feature Crack Height Measure function Magnify gate spreading of the gate range over the entire screen width Video Recording and play Auto gain function Envelope Simultaneous display of liv
24. amping 100 200 400 ohms Bandwidth amplifier bandpass 0 5 to 10 MHz Gate Monitors Two independent gates controllable over entire sweep range Rectification Positive halfwave negative halfwave fullwave RF System Linearity Horizontal 0 2 FSW Vertical 0 25 FSH Amplifier Accuracy 1 dB Reject suppression 0 to 80 full screen height Units Inch or millimeter Transducer Connections BNC Power Requirements AC Mains 100 240 VAC 50 60 Hz Dimensions 263H X 170W x 61D mm Operating Temperature 10 C to 50 C Storage Temperature 30 C to 50 C 1 3 Base Instrument Package Portable Ultrasonic Flaw Detector with Hi Resolution Color LCD Display Straight Beam Transducer 2 5 MHz 20 Angle Beam Transducer 2 5 MHz 13 mmX 13 mm 63 5 Interconnect Cable for the transducer Q9 Q9 Rechargeable Li lon Battery Package 6 6 amp hour Power supply charger unit Supporting pillar Operating Manual in English 6 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com 2 Understanding the Keypad Menu System and Display 2 1 Structure Feature The right figure gives an Ci overview of the D instrument system Ch E zal T f E gel RRE 1 The Main Uni E EE A e Main Unit eye oO oC d Os mp an e e _ Waaa we 2 Probe Transducer d HEE t E h En Se Fp i G E The Main Unit
25. at which this point is recorded becomes the baseline gain value Continue to record additional curve points up to a maximum of 16 points note that at least two DAC Curve points are required AS soon as you have recorded at least two curve reference points your DAC is already 32 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com active When complete press the key next to FINISH and follow the on screen prompts to exit the DAC program Note that stored DAC curve points can be edited as described in next section Editing DAC Curve After reference points are recorded their values may be manually adjusted or some points may be manually deleted To edit or delete points With the DAC menu accessed select EDIT submenu Press the function key next to the EDIT function Continue to press the function key or turn the knob to start the EDIT process When DAC EDIT process is triggered DAC and a digit number appear indicating the point index on the top right corner of the display Press orl to select the point to edit To adjust a point s height Press the function key next to the ADJUST function Turn the knob clockwise or anticlockwise to adjust the points echo height To delete a point Press the function key next to the DELETE function Continue to press the function key or turn the knob to delete that point from the DAC records
26. aterial thickness evaluation When the signal crosses the A or B Gate the maximum point peak of the signal in the specific gate is used for evaluation purposes The measured value is indicated in the measurement line Selecting a Gate Selecting a gate by using the GATE SEL function You can also repeatedly press to switch the selected gate between Gate A and Gate B The selected gate will be shown in Solid line The unselected gate will be shown in dashed line GATE MODE 5 INGLE H H mim 4194 9 m B LOGIC ALARM OFF gout sins AAR Uu Raten A nda A Hop AA DO 2im a 46 0 6 6 6 8 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com Positioning Gates Use the following procedures to set the vertical and horizontal position of the A and B Gates Remember that gate position has the following effects on instrument performance A Scan echoes on the right side of the display screen represent features that occur at a greater depth from the test material surface than those on the left of the display screen Therefore moving a gate to the right means that the gate is evaluating a deeper portion of the test material A wider gate will simply span the equivalent of more test material depth Increasing the vertical height called threshold of a gate means that only reflected signals of sufficiently large amplitude will cross the gate
27. ation lines e g using the stepped reference block 31 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com 1 5 3 Distance Amplitude Curve The instrument is available with Multi Curve Distance Amplitude Curve DAC function Functions for the distance amplitude curve are accessed through the DAC Menu which is located by pressing When displayed the DAC curve visually represents a line of constant reflector peaks over a range of material depths A new feature of the instrument is a multiple curve option that displays three dB offset DAC curves simultaneously Each curve represents constant reflector size at varying material depth Remember that in DAC mode the only deviation from traditional display and operation is the appearance of the DAC curve All A Scan echoes are displayed at their non compensated height A DAC curve is programmed using a series of same reflector echoes at various depths covering the range of depths to be inspected in the test material Because near field and beam spread vary according to transducer size and frequency and materials vary in attenuation and velocity DAC must be programmed differently for different applications A DAC curve can be based on up to 16 data points material depths These points are recorded from the DAC menu as described below Recording the DAC Curve DAC Curve points are typically taken from a standard
28. cation means that li only the bottom negative half of the fiiit a RF signal is displayed In the figure E ee mada above note that even though eher E REJECT negative half of the RF signal it s ENEE o A displayed in the same orientation as a pooo Mp positive component This is only to f ui Ke Kach simplify viewing The signal displayed in the view identified as Negative PULSER SIB PROBE PDELAY Rectification is the negative component of the RF signal 20 8 on ae ae ee ee EE e Full Wave Rectification combines the 2 4 0 fo positive and negative rectified signals Lt SA T together and displays both of them in Leni Beieneen a positive orientation Full wave kk Jeer rectification is recommended for most gu inspections TN 7 ts gl fy OH Pair re i i a OoNZIZd zb Zo el E Aaa IL Lee soe ab H g 087 592Gmes 520 6 0 6 0dE D PULSER RBN S PROBE POELAY Use the following procedure to select a rectification mode Activate the RCVER submenu located in the P R menu by pressing the menu key below it Three functions will appear down the right side of the display screen Press the function key next to the function titled RECTIFY You ll note that there are four options POS Shows the positive component of the RF signal NEG Shows the negative component of the RF signal but displays it in a positive orientation FULL Shows the positive and negative halves of the RF wave but both are or
29. definite conclusions may be drawn on the natural flaw roughness inclined position etc The so called AVG diagram forms the basis for this comparison of the reflecting 34 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com power This diagram consists of a set of curves showing the correlation of three influencing variables Distance between the probe and circular disk shaped equivalent reflector Difference in gain between various large circular disk shaped equivalent reflectors and an infinitely large backwall Size of the circular disk shaped equivalent reflector The influencing variable always remains constant for one curve of the set of curves The advantage of the AVG method lies in the fact that you can carry out reproducible evaluations of small discontinuities The reproducibility is most of all important for example whenever you aim to carry out an acceptance test Apart from the influencing variables already mentioned there are other factors determining the curve shape sound attenuation transfer losses amplitude correction value probe and etc The following probe parameters affect the curve shape Element or crystal diameter Frequency Delay length Delay velocity You can adjust these parameters on the instrument in such a way that you can use the AVG method with many different probes and on different materials Not
30. e Before setting the AVG function the instrument must first be calibrated because all functions affecting the AVG evaluation mode VELOCITY P DELAY DAMPING ENERGY P WIDTH XTL FREQ EFF DIAM RECTIFY can no longer be changed after the reference echo has been recorded Settings for the AVG measurement Before using the AVG feature to evaluate reflectors in test pieces the characteristics of the attached probe must be specified certain characteristics of the reference standard must be input and a reference echo must be stored You must select the REF submenu and input the characteristics for the probe you ve connected including XTL FREQ The probe s frequency rating EFF DIAM The probe element s effective diameter rating Record the Reference Echo that Defines the AVG Curve Prior to generating the AVG curve a test standard with a known reflector must be used to define a reference point Acceptable test standards include these reference types BW Backwall echo with reference defect size defined as infinity SDH Side Drilled Hole with a reference defect size defined as the hole s diameter FPH Flat Bottom Hole with a reference defect size equal to the hole s facial diameter Follow these steps to record a reference echo Select the REF submenu then the REF TYPE function This function allows you to select one of the three reference types described above Select the REF SIZE function and specify the size of
31. e Press to stop the show Or press to pause and restart the show RESET Function You can clear all channels all waves or all videos using the functions in the RESET submenu 41 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com 6 Maintenance and Care 6 1 Care of the Instrument Clean the instrument and its accessories using a moist cloth Only use the following recommended instrument cleaners water a mild household cleaner or alcohol no methyl alcohol Attention Do not use any methyl alcohol solvents or dye penetrant cleaners The plastic parts can be damaged or embrittled by this 6 2 Care of the Batteries Capacity and life of batteries mainly depend on the correct handling Please therefore observe the tips below You should charge the batteries in the following cases Before the initial startup After a storage time of 3 months or longer After frequent partial discharge 6 3 Maintenance The instrument requires basically no maintenance Attention Repair work may only be carried out by authorized Service staff of us 6 4 Warranty When used in accordance with the manufacturer s written instructions and under normal operating conditions the instrument is conditionally guaranteed to be free from defects in material and workmanship for a period of two years from date of shipment This warranty shall not apply to equipment s
32. e A scan at 60 Hz update rate and envelope of A scan display Peak Hold Compare frozen peak waveforms to live A Scans to easily interpret test results AScan Freeze Display freeze holds waveform and soundpath data B Scan display feature Real Time Clock The instrument clock keeps running tracking the time Communication High speed USB2 0 port The optional DataPro software helps manage and format stored inspection data for high speed transfer to the PC Data can be printed or easily copied and pasted into word processing files and spreadsheets for further reporting needs New features include live screen capture mode and database tracking 5 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com Battery Internal rechargeable Li ion battery pack rated 7 2V at 6600 mAh 8 hours nominal operating time depending on display brightness 8 10 hours typical recharge time Knob Operating adjustments are easily and quickly made using the rotary knob 1 2 Specifications Range 0 to 6000 mm at steel velocity Material Velocity 1000 to 9999m s Display Delay 20 to 3400 us Probe Delay Zero Offset 0 to 99 99us Sensitivity 110 dB max in selectable resolution 0 1 1 0 2 0 6 0 dB and locked Test Modes Pulse echo dual element and thru transmission Pulse Repetition Frequency ranges from 10 Hz to 1000 Hz Pulse Energy Low Medium and High D
33. ent Make sure that the two contacts on the back of the battery pack are connected with the springs in the battery compartment Close the battery compartment and fasten the attachment blocks Check the battery switch on the top of the instrument Make sure to switch it on before internal charging Note The battery switch on the top of the instrument must be set to ON when operating with the battery pack or charging it When not using the instrument set the switch to OFF to save power 3 2 Connecting a Probe To prepare the instrument for operation you have to connect a probe to it The instrument is available with the probe connectors BNC When connecting a probe to the instrument it s not only important that the probe s physical connection be properly made It s also important that the instrument is properly configured to work with the installed probe The Instrument will operate with one or two single element probes or with a dual element probe To install a single element probe connect the probe cable to either of the two ports on the front of the instrument When two probes or a dual element probe is connected to the instrument the Receive probe connector should be installed in the right port and the Transmit probe connector in the left port 13 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com oe ge ee E E Bij Gran e
34. es can be charged by means of an external battery charger Take out the battery pack from the battery compartment of the instrument Plug the charger s power cord into a 100 240 VAC power source lts Green indication lamp will illuminate when the charger is supplied with power Push the adapter of the charger into the plug receptacle of the battery pack until it snaps into place The green LED of the battery pack will light if the connection is properly aligned When charging the battery pack the battery pack s RED indication lamp will light steadily When charging is complete typically after six to eight hours the RED 43 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com indication lamp will shut off You may remove the charger adapter from the battery pack Reinstall the battery pack to the compartment of the instrument Note The battery switch on the top of the instrument must be set to ON for internal charging The battery pack should be charged over a period of time even not used 44 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com Appendix B Menu Structure AVG PULSER VELOCITY D DELAY GAIN GAIN RCVER DB STEP OFFSET COMP T CORR PROBE CSG CSC THICK O DIAM B A SCAN ANGLE SCAN B SCAN
35. g calibration especially with small thicknesses This is typical of dual element TR probes and serves for compensation of V path error With small wall thicknesses the above described effect leads to an echo amplitude drop which has to be especially taken into account with thicknesses less than 2 mm A stepped reference block having different wall thicknesses is required for calibration The wall thicknesses must be selected so that they cover the expected readings Calibration Process We recommend to use the semiautomatic calibration function for the calibration with T R probes Set the required test range Increase the probe delay until the two calibration echoes selected are displayed within the range Set the pulser and receiver functions according to the probe used and the test application Select the function group PDELAY Enter the distances of the two calibration echoes in S REF1 and S REF2 Position one gate on the first calibration echo Position the other gate on the second calibration echo Press the function key next to the selection CAL to trigger the calibration The correct calibration is confirmed by the message Calibration is finished The instrument will now automatically determine the sound velocity and the probe delay and set the corresponding functions accordingly The value of the function P DELAY will be set to the correct value If necessary check the calibration on one or several known calibr
36. he function X VALUE enables you to set the X Value distance between the probe s leading face and probe index sound exit point of the probe used This value is required for the automatic calculation of the reduced projection distance Adjustment range 0 50 mm 23 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com 4 18 Probe Delay Calibration Every probe has a delay line between the transducer element and the coupling face This means that the initial pulse must first pass through this delay line before the sound wave can enter the test object You can compensate for this influence of the delay line in the function P DELAY If the value for P DELAY is not known read Chapter 5 in order to determine this value 4 19 Setting the Angle of Incidence The ANGLE function enables you to adjust the angle of incidence of your probe for the material used This value is required for the automatic calculation of the flaw position The angle of incidence for the straight beam probe is fixed to 0 Adjustment range 0 80 4 20 Magnifying the Contents of a Gate Whenever an A Scan is active pressing the E key enlarges the displayed portion of the A Scan contained in the selected gate Any of the available gates may be specified as the selected gate The width of the magnified gate determines the level of magnification since the display is magnified until the
37. hickness value represented by the full horizontal width of the screen will normally be set to a value equal to or slightly larger than the calibrated standard Activate the BASE submenu located in the BASIC menu by pressing the menu key below it Three functions will appear down the right side of the display screen Press the function key next to the selection titled RANGE You ll note that RANGE has both coarse and fine adjustment modes Coarse and fine modes are selected by repeatedly pressing the corresponding function key next to it To change the range turn the knob Note that the maximum of range setting is 6000 mm The display s horizontal range will remain as set Range is selectable in fixed steps or continuously variable 7 Range End 6a G lo5 9 a 250 0 Haa AAt 5920mrE 732 0 0 0 0 0dE 4 2 Setting the Material Velocity Use VELOCITY to set the sound velocity within the test object Always ensure that the function VELOCITY is correctly set The instrument calculates all range and distance indications on the basis of the value adjusted here Velocity range 1000m s 9999m s Coarse adjustment in steps as follows 2260m s 2730m s 3080m s 3230m s 4700m s 5920m s 6300m s Fine adjustment 1000 9999 in steps of 1 m s 4 3 Setting the Display Delay Here you can choose whether to display the adjusted range for example 300 mm starting from the surface of the test object or in a section of the test object 15
38. iented in the positive direction RF Shows the echo with no rectification Select the rectification method 17 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com 4 6 Setting the A Scan Reject Level The function REJECT allows you to suppress unwanted echo indications for example structural noise from your test object To omit a portion of the A Scan you must define the percentage of full screen height you wish to omit You may omit A Scan up to 80 of the screen height To Set a reject percentage Activate the RCVER submenu located in the P R Menu by pressing the menu key below it Press the function key next to the selection REJECT Set the required percentage value by turning the knob You should handle this function with great caution as it may of course happen that you suppress echoes from flaws as well Many test specifications expressly forbid using the reject function 4 7 Setting the Gain Instrument gain which increases and decreases the height of a displayed A Scan is adjusted with the gain functions The gain is displayed as A B C dB It includes the basic gain the offset gain and the sensitivity correction The maximum of the total gain A B C is 110 dB Tela baas SC DD 5926mes SEN A SE The offset gain is for the purpose of flaw evaluation The DAC AVG curves remain the same when adjusting the offset gain Sensi
39. key next to the selection titled DB STEP Change the DB STEP value by repeatedly pressing the corresponding function key or by turning the knob Note that DB STEP value can be quickly changed by repeatedly pressing the keyL 4 9 Auto Gain Feature Use the Auto Gain function to automatically set the basic gain so as to adjust the peak echo to a target height Set the target echo height using the AUTO function located in the FUNC Submenu Press to start the Auto Gain function AUTO XX will be shown on the screen The Auto Gain function will end when the echo height reaches the target value Or you can stop the function by pressing again 4 10 Configuring the Gates The gates monitor the range of the test object where you expect to detect a flaw lf an echo exceeds or falls below the gate an alarm signal is sent out via the ALRM LED The gate chooses the echo for the digital time of flight or amplitude measurement The instrument has two gates A gate and B gate Gate A and B are independent of one another Setting the position and characteristics of the A and B Gates is the first step to configuring the instrument for flaw detecting or material thickness measurement The GATE menu controls not only the location of the A and B Gates but also the alarms and other features activated when an A Scan signal crosses a specific gate A Scan signals crossing the A or B Gate are evaluated for the purposes of flaw detection and m
40. l S K N wh es f we Ge E wy an E E St H a es a Connect one single element probe to either port Connect leads from a Dual Element Probe to both ports For through transmission connect two single element probes to the transmit left labeled as Ll and receive right labeled as ak ports 3 3 Starting the Instrument To start the instrument press the switch on kevl l If it operates on the internal battery pack make sure to set the battery switch to ON position before starting The start display of the instrument appears here you will also see the current software version and the serial number of the instrument The instrument carries out a self check and then switches over to stand by mode The settings of all function values are the same as before switching on of the instrument The instrument will shut off automatically when the battery capacity level is too low 14 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com 4 Operation 4 1 Adjusting the Display Range The function group BASE enables you to make the basic adjustment of the display range The display on the screen must be adjusted for the material to be tested and for the probe used Calibration requires the use of calibrated standard made of the same material as the test piece Prior to calibrating the instrument probe combination the A Scan display screen range the material t
41. lity that you have come to expect from the popular Mitech MFD Series of instruments remain Display Hi resolution 320 XxX 240 pixels multi color TFT LCD Display with nine user selectable color display schemes and brightness control provides high contrast viewing of the waveform from bright direct sunlight to complete darkness The hi resolution color LCD display with fast 60 Hz update gives an analog look to the waveform providing detailed information that is critical in many applications including nuclear power plant inspections Range Up to 6000 mm in steel Suitable for use on large workpieces and in high resolution measurements Pulser Pulse Energy selectable among Low Medium and High Pulse Repetition Frequency adjustable from 10 Hz to 1 KHz in 1 Hz increments Damping selectable among 1002 2002 and 4002 for optimum probe performance Test Modes include Pulse echo dual and thru transmission Receiver Sampling 10 digit AD Converter at the sampling speed of 160 MHz Rectification Positive Halfwave Negative Halfwave Fullwave and RF Analog Bandwidth 0 5MHz to 10MHz capability with selectable frequency ranges automatically set by the instrument to match probe for optimum performance Gain O dB to 110 dB adjustable in selectable steps 0 1 dB 2 dB 6 dB and locked 4 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com Gates
42. lled all instrument settings are modified to match the settings stored in the channel file Once a channel file is opened instrument settings may be modified from their channel file configurations If necessary save the current instrument setup to a new channel file before loading a channel file Channel CLEAR Channel files are cleared using this procedure Activate the CHANNEL submenu located in the MEM menu by pressing the menu key below it Press the function key next to the FILE function Turn the knob until the desired file name appears Press the function key next to the CLEAR function Continue pressing the function key or turn the knob to perform the file CLEAR function It will prompt out Clear this channel Press the menu key below YES to confirm the operation or press the menu key below NO to cancel the operation Note The deleted file may not be retrieved The current settings of the instrument will be reset to default after the channel clear operation Video Files Video file DV01 is used to store a segment of video To record a segment of video Activate the video recording operation by pressing 2 An icon will appear in the status area when recording the video To stop the recording simply press once more Note that the recording process will automatically end when the video file is full Use RECALL function to RECALL a video file The recalled video file will be shown at a fixed refresh rat
43. ly set the parameters 29 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com Calibration Process Set the required display range in RANGE The two calibration echoes selected must be displayed on the screen Set the range so that the second calibration echo is located on the right edge of the screen Select the function group PDELAY Enter the distances of the two calibration echoes in S REF1 and S REF2 Position one gate on the first calibration echo Position the other gate on the second calibration echo Press the function key next to the selection CAL to trigger the calibration The correct calibration is confirmed by the message Calibration is finished The instrument will now automatically determine the sound velocity and the probe delay and set the corresponding functions accordingly The value of the function P DELAY will be set to the correct value If the instrument is not able to carry out any valid calibration on the basis of the input values and the echoes recorded a corresponding error message is displayed In that case please check the values of your calibration lines and repeat the process of recording the calibration echoes Example Enter the distances thicknesses of the two calibration lines S REF1 225 mm and S REF2 450 mm Position one gate on the first calibration echo Position the other gate on the E ee
44. menu contains several submenus Menus and submenus are selected by pressing the key below the desired item F1 to F5 When a submenu is selected the functions contained in that submenu are listed in the Function Bar down the right hand side of the display screen Functions are then selected by pressing the adjacent Function Key S1 to S4 Turning the Function Knob and in some cases continuing to press the adjacent Function Key will change the value shown in the selected function s box Note that some functions like RANGE have both coarse and fine adjustment modes Coarse and fine modes are selected by pressing the adjacent Function Key more than once An icon of will appear on the left of the function name when the function is in fine adjustment mode When the function is in coarse adjustment mode turning the function knob will produce large changes in the selected function s value When the function is in fine adjustment mode turning the function knob will change the value by smaller amounts 2 5 Alarm Lights Two alarm lights appear at the top right corner front of the instrument s keypad One alarm light is marked as ALRM which is assigned to the gate alarm When a gate alarm is triggered this light will illuminate The other light is marked as PWR indicating power and battery status 11 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www N
45. mine whether you need the highest possible PRF value or whether you are satisfied with a low value The PRF value ranges from 10 Hz to 1000 KHz The larger your workpiece the smaller PRF values are needed in order to avoid phantom echoes In the case of smaller PRF values however the A Scan update rate becomes lower for this reason high values are required if a workpiece should be scanned fast The best way to determine the suitable PRF value is by experimenting start from the highest step and reduce the value until there are no more phantom echoes To set the PRF level Activate the PULSER submenu located in the P R menu by pressing the menu key below it Press the function key next to the function titled PRF Change the PRF value by turning the knob 4 15 Specifying the Probe Frequency In this function you can specify the probe frequency according to the frequency of your probe The instrument will automatically utilize a built in filter to match the probe frequency Activate the PROBE submenu located in the P R menu by pressing the menu key below it Press the function key next to the selection titled XTAL FREQ To change the specified frequency turn the knob The probe frequency will be set to the last one displayed 4 16 Specifying the Piezo Crystal Size Use EFF DIAM function to set the Piezo Crystal Size of your probe This value is required when programming the AVG 4 17 Setting the Probe X Value T
46. ng Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com H 1 ITA COLOR HAY COLOR H mm 95 8 om LL BRIGHT eer Al Al g peer H i id f Pom r DD 123 8 AW 25 0 356 4 AA 148 4 hi TEAN k 356 4 CHOG 887 Fames 46 0 6 8 8 80 6 D CHAG DO Dom ag 46 0 6 8 68 AdE 4 26 Setting the Display Brightness Use the function BRIGHT to set the display brightness You can choose between four brightness options 25 50 75 and 100 Activate the LCD submenu located in the CFG menu by pressing the menu key below it Four functions will appear down the right side of the display screen Press the function key next to the selection titled BRIGHT To change the brightness level continue pressing the function key or turn the knob The display brightness will remain at the level last displayed Note For the 25 option the instrument consumes less current and consequenily increases the operating time in battery operation 4 27 Setting the Display Color The SYS COLOR value determines the color of the background the gate and the DAC AVG curves All color schemes are recommended for indoor operation while SO and S3 are best suited for outdoor operation Activate the LCD submenu located in the CFG menu by pressing the menu key below it Four functions will appear down the right side of the display screen Press the function next to the selection titled SYS COLOR The
47. ogic B Mess BwS4E 4 SS CHES 885 G nge d r pd GATE MODE 3 INGLE B LOGIC ve i Turning the Audible Alarm On or Off When a gate alarm is activated one or more of the following will occur An alarm indication light on the front of the instrument will illuminate An audible alarm HORN will sound Use the following procedure to turn the horn off or on Activate the LOGIC submenu located in the GATE menu by pressing the menu key below it Select the ALARM function and turn the audible alarm ON or OFF EA NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com Setting the Gate Work Mode Two options for the gate work mode SINGLE and E E SINGLE measures the distance from the surface to the peak echo E E Echo Echo mode measure the distance between two peak echoes the two peak echoes should be selected by two gates It is very useful in thickness measuring Use the GATE MODE function in the LOGIC submenu to select the gate work mode Aa nanan BAL 2 2558 aha nebo BA W385 250 8 CHAG eae 5920m z727 0 0 8 6 0d B D HDD Ae Di im 5 22 4 6 8 6 60E mu 4 11 Setting the Damping Level This function serves for matching the probe You can use it to adjust the damping of the probe s oscillating circuit and to consequently change the height width and resolution of the echo display Activate the PULSER submenu located in
48. ppear near the Y o eff 2 cc down right of the display You can use Elle this function to record and document ur a Sree E the peaked maximum echo display To activate the Peak Hold Feature Activate the FUNC submenu located in the GATE menu by pressing the menu key below it Press the function key next to the selection titled PEAK HOLD To turn on off the Peak Hold function continue pressing the function key or turn the knob Also you can continue pressing to turn on off the Peak Hold function Note that Peak Hold and Envelop cannot function simultaneously 5 10 B Scan Feature In B Scan mode the instrument displays a graphical cross section of the workpiece cocoon n o E E SCAN EHEHEHE Sp SCAN BSCAN DIR Leah ep HY AH DAD AB W D 248 8 Hop 463 57 Dm 4 0 6 8 8 806 39 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com Use the following procedure to switch to B Scan mode Select the B SCAN function Switch the value to ON by means of the knob Use the BSCAN DIR function to set the scan display direction 5 11 Data Storage The instrument is equipped with a data storage system A Scans patterns instrument settings and video can be stored in data files for later retrieval File data can be saved recalled and deleted by using the MEM menu Wave Files Wave files are used to store A Scan pattern along
49. re are nine preset color schemes To change the display s color scheme continue pressing the function key or turn the knob The display color will remain at the scheme last displayed 4 28 Setting the A Scan Color Activate the LCD submenu located in the CFG menu by pressing the menu key below it Press the function key next to the selection titled WAV COLOR There are eight A Scan color options To change the A Scan s color continue pressing the function key or turn the knob The A Scan echo will remain the color last displayed 26 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com 4 29 Key Sound The key sound can be turned on or off using the KEY SOUND function located in the HORN submenu 4 30 Date and Time Setting For a correct documentation you should always make sure that you are using the correct date and time setting Activate the CLOCK submenu located in the CFG menu by pressing the menu key below it Two functions will appear down the right side of the display screen Press the function key next oli the function Y M D The date is ii PEA displayed in Year Month Day cl format Note that the first time Lil you press the function key the year item is highlighted The next time you press the function key the month item is highlighted Finally pressing aoe A he P a te ae Sch highlighted To change
50. ructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com easily and quickly Position the selected gate over the echo from the backwall of the workpiece Activating the SIZE submenu locating in the GATE menu by pressing the corresponding key below it Select the BACK GAIN function Then press the corresponding function key next to it to trigger the back echo recording and analysis process The instrument will record the echo and calculate the required gain sensitivity automatically And then the instrument will automatically adjust the gain to the calculation result Position the selected gate over the echo from the flaw Select the CALC function Then press the corresponding function key next to it to calculate the equivalent size The calculation result the equivalent size of the flaw will be displayed in the CALC bar 5 7 Crack Height Measuring Feature This feature allows measuring the height of a crack found inside the workpiece Before starting to use the Crack Height Measure function the instrument and the probe must be correctly calibrated Activate the CRACK submenu locating in the GATE menu by pressing the corresponding key oP a below it Position the selected gate over the echo from the first point of the crack Then record this position using the A POINT function Position the selected gate over Ak the echo from the second point of Crack Height the crack
51. t Activate the RCVER submenu located in the P R menu by pressing the menu key below tt Press the function key next to the selection titled PRB MODE To change the probe mode turn the knob Each available probe mode is represented by an icon that s displayed near the down right corner of the display whenever that probe mode is indicated The probe mode will be set to the last one displayed 4 5 Selecting a Rectification Mode You can select the rectification mode of the echo pulses according to your application in the function RECTIFY Rectification effects the orientation of the A Scan on the display screen The A Scan represents the pulse echo that s returned from the material being tested to the instrument The series of echoes looks like the Radio Frequency RF signal 16 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com EES 4 be ab 8 mm Note that the RF signal has a negative 1 component below the axis and ai lr SE positive component above the axis eege e SINGLE RF rectification is useful when h HURI j evaluating a probe TTT REJECT RF rectification is forbidden when EELE ay displaying the DAC AVG curves CHES 087 Gong 520 0 0 6 0dE PULSER KI PROBE POELAY Positive Half Rectification means that only the upper positive half of the RF Ire signal is displayed ee ae ee ee EE e Negative Half Rectifi
52. the P R menu by pressing the menu key below it Press the function key next to the selection titled DAMPING To change the specified damping level and optimize the A Scan signal appearance continue pressing the function key or turn the knob You ll note that the following damping levels are available 1000 2000 4000 The damping level will be set to the one last displayed 4 12 Setting the Pulse Energy Level Use the function ENERGY to set the pulser voltage The relative energy with which the pulser fires can be set to LOW MEDIUM or HIGH The setting MEDIUM is recommended for most inspections HIGH is used for inspections in which maximum sensitivity is import e g for the detection of small flaws Choose the setting LOW for broadband probes or if narrow echoes are required better lateral resolution To set the pulser energy Activate the PULSER submenu located in the P R menu by pressing the menu key below it Press the function key next to the function titled ENERGY Select the energy level by turning the knob or continuing to press the function key 22 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com 4 13 Setting the Pulse Width This function is Not Available for MFD350 4 14 Adjusting the Pulse Repetition Frequency PRF The pulse repetition frequency indicates the number of times an initial pulse is triggered per second You can deter
53. the calibration block Set the required display range in RANGE The calibration echo must be displayed on the screen Position the gate on one of the calibration echoes until the sound path of the echo is indicated in the measurement line After this change the adjustment of the function P DELAY until the correct sound path for the selected calibration echo is indicated in the measurement line Example You are carrying out the calibration for the calibration range of 300 mm via the function group BASE using the calibration block DB P thickness 225 mm which is laid flatwise Set RANGE TO 300 mm Set the known material velocity of 5920 m s in VELOCITY Set the gate so that it is positioned on the first calibration echo from 225 mm Read the sound path in the measurement line If this value is not equal to 225 mm change the adjustment for the function P DELAY until it is at 225 mm 225 This completes the calibration of the instrument to the material velocity of 5920 m s with a calibration range of 300 mm for the straight beam probe used Case B With Unknown Material Velocity Use the semiautomatic calibration function of the instrument via the function group CAL for this calibration case The distances between 2 calibration echoes must be entered as default data The instrument will then carry out a plausibility check calculate the material velocity and the probe delay and automatical
54. the known 35 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com standard s reference flaw Select the AVG submenu then the PROGRAM function Turn the knob to start the AVG program When AVG program is triggered AVG appears indicating the point index on the top right corner of the display Couple the probe to the known standard capture the reference flaw so that its reflected echo is displayed on the instrument s A Scan and adjust selected Gate s starting point to ensure that the resulting echo triggers the gate Adjust the gain until the reference flaws A Scan peak measures 80 of FSH Full Screen Height With the probe coupled to the standard and the reference flaw s echo captured by selected Gate press the function key next to the RECORD function to record an AVG reference echo After the AVG reference echo is recorded its value may be manually adjusted using the ADJUST function When complete press the key next to FINISH and follow the on screen prompts to exit the AVG program Note that only one AVG reference echo can be stored at a time To delete the currently stored reference Access the DEL submenu Select DEL AVG and then follow the on screen prompts Once a reference echo has been recorded the AVG curves the AVG UL the AVG ML and the AVG DL are automatically displayed using default settings Creating AVG
55. tivity correction Compensate for the transfer losses in the material under test This correction is necessary if test object and reference block have different surface qualities You have to find out the adjustment value for the compensation of transfer losses by experiments The gain is varied accordingly in this correction while the curve line remains the same To set the sensitivity correction select the function T CORR and then adjust its value according to the experiment When DAC is active adjusting the basic gain setting will result in an equal adjustment of the DAC curve position To increase the instrument gain without changing the DAC curve position use the T CORR function to compensate for varying couping surface conditions 4 8 Changing the Gain Adjustment Increment DB STEP When adjusting the A Scan Gain each click of the adjustment knob increases or decreases the gain level by a dB increment equal to the DB STEP Several values can be specified for DB STEP Available increments include 0 1dB 1dB 2dB 6dB and OGdB Note that setting the DB STEP to OdB prevents adjustment of the instrument gain and prevents any changes using the knob 18 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com To select one of the existing DB STEP values Activate the GAIN submenu located in the BASIC menu by pressing the menu key below it Press the function
56. trument 42 622 Care Or IMG EE 42 6 3 IVIGIMTCMAING C eege ee EE 42 OF VV Tu E 42 SE NMOS OM Al EE 42 Appendb Gren Ere 43 Appendix A Charging the battries cccccecccssseeceeeeeeseeseseseseeseeeeneeeeess 43 Appendix ENEE Eet 45 3 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com 1 Introduction The MFD350 is an advanced digital ultrasonic flaw detector featuring a multi color TFT LCD and a host of new features to meet challenging inspection requirements It combines powerful flaw detection and measurement capabilities extensive data storage and the ability to transfer detailed inspection data to the PC via its high speed USB port The instrument incorporates many advanced signal processing features including a 10OMHz RF bandwidth to permit testing of thin materials narrowband filters to improve signal to noise in high gain applications and a spike pulser to optimize penetration on thick or highly attenuating materials The instrument can be widely used in locating and sizing hidden cracks voids disbands and similar discontinuities in welds forgings billets axles shafts tanks and pressure vessels turbines and structural components 1 1 Features of the Instrument The instrument extends the performance and range of applications that are capable of being satisfied by a portable instrument The quality portability durability and dependabi
57. ubjected to misuse or abuse improper installation alteration neglect or accident Excluded from this warranty are expendable items such as transducers interconnecting cables and batteries This warranty is limited to the original purchaser and is not transferable No other warranty expressed or implied is made 6 5 Tips on Safety The design of the instrument meets safety standard During the operation it shall meet the specified external ambient condition and the operator shall be furnished with concerned technology background so as to guarantee safe operation Note 1 This instrument is a non destructive inspection instrument for inspecting material it is not allowed to use as a medical instrument 2 The instrument is limited to be used in lab and industrial environment 42 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com Appendix Appendix A Charging the Battries The approximate level of remaining battery life is visually displayed by the battery indicator When fresh batteries with full capacity are installed the icon will appear as El As the battery life is consumed the icon will begin to empty When the battery indicator is almost empty as indicated by the symbol TT charge the batteries as soon as possible You may take a second battery pack or replacement battery pack with you if you cannot connect the instrument to
58. ument on or off Db Step key selects the gain submenus or switch the db step Gate key Gate functions selecting gate functions and Gate A B switch 10 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com Range key Range function selecting Probe Delay key Probe Delay calibration Probe Angle key selects the angle calibration functions Save key performs a data storage of the A Scan pattern Auto Gain key starts or stops the Auto Gain function J Envelope key turns the Envelope function on and off PEAK ej Peak Hold key turns the Peak Hold function on and off Video key starts or stops recording a segment of the display DAC AVG key selects the menus of DAC AVG searches next echo towards left or move the cursor to left when inputting digit numbers searches next echo towards right or move the cursor to right when inputting digit numbers confirms or switches current selection Rotary knob For direct setting the currently selected function A single key press on the rotary knob will function as pressingL 2 4 Menus and Functions The instrument menu system consists of several menus submenus and functions It allows the operator to select and adjust various features and instrument settings Available menus are accessed via the Home Menu Note that the menus visible on your particular instrument depend on which options are installed Each
59. unction key next to the DEL DAC function Press the function key next to the DEL DAC function a second time or turn the knob Then confirm your selection Turning On Off the DAC display Turning DAC DISP On and Off causes the DAC curves to be displayed or removed With the DAC menu activated select the DISP submenu Press the function key next to the DAC DISP function Press the function key next to the DAC DISP function a second time or turn the knob to turn On Off the DAC display Note that if the DAC curve is not created it will prompt out No DAC curve found and DAC DISP will be set to OFF Echo Evaluation with DAC In order to be able to evaluate a flaw indication by means of the DAC certain conditions must be met The DAC must already be recorded It only applies to the same probe that was used when recording the curve Not even another probe of the same type must be used The DAC only apply to the material corresponding to the material of the reference block All functions affecting the echo amplitude must be set the same way as they were when the curve was recorded 5 4 Measuring with DGS AVG Using the AVG the same as DGS function you can compare the reflecting power of a natural flaw in the test object with that of a theoretical flaw circular disk shaped equivalent reflector at the same depth Note You are comparing the reflecting power of a natural flaw with that of a theoretical flaw No
60. w YES to confirm the reset operation Or press the menu key below NO to cancel the reset operation NOTE The effects of resetting the instrument may not be reversed No key action should be performed during resetting process 4 33 Connecting to a Computer The instrument is equipped with a USB port at the upper left of the instrument The PC can connect with the instrument via the USB port A Scan display instrument settings and videos stored in the memory of the instrument can be transferred to the computer through the USB port Detailed information of the communication software and its usage refer to the software manual 28 NDTzone Non Destructive Testing Equipment Specialists Tel 1 877 363 4243 eMail sales NDTzone com Web www NDTzone com 5 Calibration and Measurement Before working with the instrument you have to calibrate the instrument you have to adjust the material velocity and display range and allow for the probe delay depending on the material and dimensions of the test object To ensure a safe and proper operation of the instrument it is necessary that the operator be adequately trained in the field of ultrasonic testing technology Below you will find some examples of common calibration methods for certain test tasks 5 1 Calibration with Straight and Angle Beam Probes Case A With Known Material Velocity Calibration process Set the known material velocity in VELOCITY Couple the probe to

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