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EMC TEST REPORT

1. Ambient temperature 21 0 C Relative humidity 42 96 Climate condition Atmospheric pressure 100 5 kPa Table Binerueney Azimuth Polarity Observation Penormanta MHz Result degree 5 Horizontal AN BL Vertical AM BU T Horizontal AX BL Vertical AX BL 80 1 000 See Note 468 Horizontal AN BL Vertical AX BL Horizontal AX BL 270 Vertical AM BU NOTE There was no change compared with initial operation during the test 50 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS en 4 7 Electrical fast transient burst E Test on power supply ports and on protective earth terminals Stationary floor mounted equipment The test voltage applied between a reference ground plane and each of the power supply terminals a c or d c and on the terminal for the protective or function earth on the cabinet of the EUT The EFT B generator shall be located on the reference plane The length of the hot wire from the coaxial output of the EFT B generator to the terminals on the EUT is not exceeding 1 m This connection was unshielded but well insulated All other connections of the EUT are in accordance with its functional requirements Non stationary mounted EUT connected to the mains supply by flexible cord and plugs The test voltage is applied between each of the power supply conductors and the protective earth at the
2. Product MONITOR 2008 Aug 02 6 07pm Serial no None Page 1 of 1 Description Test Date 2008 Aug 02 4 20pm Result Name HAR_DVI Type of Test EN61000 2006 Harmonics inc interharmonics to EN61000 4 7 2002 Limits Class D Power Analyzer Voltech PM6000 SN 100006700167 Firmware version v1 20 06RC3 Channel s 1 SN 090015500508 25 Adjusted Date 22 JUL 2007 2 SN 090015500521 25 Adjusted Date 23 JUL 2007 3 SN 090015500543 25 Adjusted Date 5 AUG 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None Shunt s 1 SN 091024300502 4 Adjusted Date 14 JUL 2007 2 SN 091024300503 4 Adjusted Date 14 JUL 2007 3 SN 091024300504 4 Adjusted Date 14 JUL 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None AC Source Mains Manual Source Harmonic Results Notes Against Chosen Limits Voltage Crest Factor outside permitted limits PASS Test Parameter Details User Entered Measured Operating Frequency 50 49 9840 Operating Voltage 230 230 2049 Specified Power 192 0000 189 7326 Fundamental Current 0 0000 0 8552 Power Factor 0 0000 0 9605 Average Input Current 0 8578 Maximum POHC 0 0059 POHC Limit 0 0826 Maximum THC 0 0701 Minimum Power 75 Class Multiplier 1 0000 Test Duration 00 02 30 31 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory YA
3. Project No LBE081805 LCD Monitor MG32PS Final Measurement Detector 1 Frequency Quasi Peak Line Corr Margin Limit MHz dB y V dB dB dB xu V 0 172 500 45 9 L1 9 6 18 9 64 8 0 199 500 43 6 N 9 6 20 0 63 6 0 303 500 43 9 N 9 6 16 3 60 1 0 368 500 43 2 N 9 6 15 3 58 5 0 419 500 45 2 N 9 6 12 3 57 5 0 509 500 51 4 N 9 6 4 6 56 0 0 537 500 51 7 N 9 6 4 3 56 0 0 616 500 42 9 L1 9 6 13 1 56 0 0 812 500 37 0 L1 9 7 19 0 56 0 0 966 500 33 9 L1 9 7 22 1 56 0 Final Measurement Detector 2 Frequency Average Line Corr Margin Limit MHz dB y V dB dB dB x V 0 321 500 31 1 N 9 6 18 5 49 7 0 429 500 27 5 N 9 6 19 7 47 3 0 508 500 41 7 L1 9 6 4 3 46 0 0 579 500 40 4 N 9 6 5 6 46 0 0 642 500 21 7 L1 9 7 24 3 46 0 0 814 500 23 7 L1 9 7 22 3 46 0 1 158 500 23 8 L1 9 7 22 2 46 0 1 389 500 22 1 L1 9 7 23 9 46 0 1 623 500 20 8 L1 9 7 25 2 46 0 17 080 500 27 9 N 10 1 22 1 50 0 14 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS en Operating condition HDMI to DVI connected _ Ping test Test date 2008 07 31 Test engineer Hyun Jeong Jang Climate condition ambient Bd c ees 40 Atmospheric 409 7 pa temperature humidity pressure Test place Shielded Room 1 QP Quasi peak AV Average Note Result
4. 1 821mA 1 849mA 0 211mA 0 234mA 18 95mA 28 43mA 1 273mA 1 307mA 0 208mA 0 227mA L1 Reading is below limit 1 L2 Reading is below limit 2 N A Harmonic current below 0 696 of rated current or 5mA whichever is greater are disregarded 34 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS en Operating condition Magic Network _ Ping test Test date 2008 08 04 Test engineer Hyun Jeong Jang Ambient temperature 24 2 Relative humidity 40 96 Climate condition Atmospheric pressure 100 5 kPa Test place Shielded Room 3 Product MONITOR 2008 Aug 02 5 07pm Serial no None Page 1 of 1 Description Test Date 2008 Aug 02 3 56pm Result Name HAR_MAGICN Type of Test EN61000 2006 Harmonics inc interharmonics to EN61000 4 7 2002 Limits Class D Power Analyzer Voltech PM6000 SN 100006700167 Firmware version v1 20 06RC3 Channel s 1 SN 090015500508 25 Adjusted Date 22 JUL 2007 2 SN 090015500521 25 Adjusted Date 23 JUL 2007 3 SN 090015500543 25 Adjusted Date 5 AUG 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None Shunt s 1 SN 091024300502 4 Adjusted Date 14 JUL 2007 2 SN 091024300503 4 Adjusted Date 14 JUL 2007 3 SN 091024300504 4 Adjusted Date 14 JUL 2007 4
5. 60 EN 55022 B Voltage on Mains QP 50 nd Ka EN 55022 B Voltage on Mains AV a rs L S 40 Tq E gt o Ss i 301 20 10T 0 150k 300 400 500 800 1M 2M 3M 4M 5M 6 8 10M 20M 30M Frequency in Hz 17 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Final Measurement Detector 1 Frequency Quasi Peak Line Corr Margin Limit MHz dB u V dB dB dB u V 0 350 500 43 0 N 9 6 16 0 59 0 0 434 500 45 6 N 9 6 11 6 57 2 0 511 500 50 3 N 9 6 5 7 56 0 0 539 500 52 6 N 9 6 3 4 56 0 0 614 500 41 2 L1 9 6 14 8 56 0 2 739 500 34 5 L1 9 7 21 5 56 0 3 412 500 39 1 L1 9 8 16 9 56 0 4 182 500 43 3 L1 9 8 12 7 56 0 Final Measurement Detector 2 Frequency Average Line Corr Margin Limit MHz dB u V dB dB dB u V 0 320 500 30 9 N 9 6 18 8 49 7 0 509 500 41 1 N 9 6 4 9 46 0 0 577 500 41 3 N 9 6 4 7 46 0 2 951 500 30 0 N 9 7 16 0 46 0 3 188 500 32 2 N 9 7 13 8 46 0 4 183 500 33 7 N 9 8 12 3 46 0 4 304 500 29 3 N 9 8 16 7 46 0 5 311 500 32 6 L1 9 8 17 4 50 0 18 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Lm Operating condition LAN TEST _ 100M Full Duplex Test date 2008 07 31 Test engineer Hyun Jeon
6. 1 1 Emission 1 2 Immunity 2 General Information 2 1 Test facility 2 2 Accreditation and listing 2 3 EUT Description 3 Test configuration 3 1 Test Peripherals 3 2 EUT operating mode 3 3 Details of Sampling 3 4 Used cable description 3 5 EUT Description 3 6 Description of the EUT exercising method 3 7 Performance Criteria 3 8 Measurement uncertainty 3 9 Measurement uncertainty 4 Result of individual tests 4 1 Conducted disturbance 4 2 Radiated disturbance 4 3 Harmonics current 4 4 Voltage fluctuation amp Flicker 4 5 Electrostatic discharge 4 6 Radiated radio frequency electromagnetic field 4 7 Electrical fast transient burst 4 8 Surge 4 9 Conducted disturbances induced by radio frequency fields 4 10 Voltage dips short interruptions and voltage variations Appendix EUT photography 2 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS en 1 Summary of test results 1 1 Emission The EUT has been tested according to the following specifications Applied Test type Applied standard Result Remarks Meets Class B Limit Xx EP Complied Minimum margin is EN55022 1998 A1 200 3 4 dB at 0 539 MHz 0 A2 2003 Meets Class B Limit xX Radiated Disturbance Complied Minimum margin is 6 0 dB at 633 412 MHz EN61000 3 2 2000 X Harmonics current A2 2005 Complied X Voltage fluctuation amp EN61000 3
7. LCD Monitor MG32PS er 4 9 5 Test results Test date 2008 08 02 Hyun Jeong Jang Ambient temperature 23 7 C Relative humidity 51 Climate condition Atmospheric pressure 100 3 kPa F Field A requency Strength Injection Inject Points Observation Performance MHz Method Cable length Note No Result Vr m s 3 CDN M3 AC power line 1 8m Note 1 2L AXK BLE 3 CDN T4 LAN 10m Note 1 20 AL BL 3 CDN T2 Telephone 10m Note 1L 20 AO BUO 0 15 80 3 CLAMP DC 1 8m Note 1 20 AL BI 3 CLAMP Printer 2m Note 1 20 AO BLU 3 CLAMP VGA 1 8m Note 1 20 AO BO NOTE 1 There was no change compared with initial operation during the test 2 The transmission of data from modem port stopped during the test but self recoverable after the test This permissive loss of performance is specified by the manufacturer and this phenomenon will be put as a clear statement in the User s Manual to avoid misunderstanding 61 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS 4 10 Voltage dips short interruptions and voltage variations The EUT is tested for each selected combination of test levels and duration with a sequence of tree dips interruptions with intervals of 10 s minimum between each test event Each representative mode of operation shall be tested Abrupt changes in supply v
8. Reading 1 0 006 0 368 0 40 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS er Operating condition Magic Network _ Ping test Test date 2008 08 04 Test engineer Hyun Jeong Jang Ambient temperature 24 2 Relative humidity 40 96 Climate condition Atmospheric pressure 100 5 kPa Test place Shielded Room 3 Product MONITOR 2008 Jul 29 10 47am Serial no None Description Result Name FLI MAGICN Voltech IEC61000 3 Windows Software 1 10 04RC5 Test Date 2008 Jul 29 10 23am Type of Test Flickermeter Test Table Power Analyzer Voltech PM6000 SN 100006700167 Firmware Version v1 20 06RC3 Channel s 1 SN 090015500508 25 Adjusted Date 22 JUL 2007 2 SN 090015500521 25 Adjusted Date 23 JUL 2007 3 SN 090015500543 25 Adjusted Date 5 AUG 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None Shunt s 1 SN 091024300502 4 Adjusted Date 14 JUL 2007 2 SN 091024300503 4 Adjusted Date 14 JUL 2007 3 SN 091024300504 4 Adjusted Date 14 JUL 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None AC Source Mains Manual Source Overall Result Notes Measurement method Voltage PASS Ps def dmax d Sams Limit 1 000 ed T Reading 1 0 152 0 0
9. Relative humidity 4296 Climate condition Atmospheric pressure 101 0 kPa Test place 10m Semi Anechoic Chamber 2 Receiving antenna mode Horizontal Vertical Test distance 10 m RF Semi Anechoic Chamber Result Reading c f Antenna factor Cable loss Amp Gain Margin Limit Result Note SAMSUNG lt lt Radiated Emission gt gt 24 July 2008 14 05 R4 10m Chamber 2 magicn dat Model d Standard CISPR Pub 22 Class B 10m Serial Remark1 Operator B Remark2 AC Power Remark3 Temp Humidity Remark4 dB uV m 60 lt 10m_CISPRB gt Limit lt magicn gt 50 E Spectrum H PK L Spectrum V PK Suspected Item H Suspected Item V Final Item H QP Final Item V QP No Frequency Reading Result Limit Margin Remark dB uV dB 1 m dB uV m 8 41 2 21 3 633 412 672 017 1 2 3 4 5 Vertical Polarization Q P No Frequency Reading gf Result Limit in Remark MHz dB uV dB 1 m dB uV m 1 169 797 38 1 19 1 19 0 2 500 033 35 2 8 7 26 5 3 940 682 27 8 zr 26 1 26 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 4 3 Harmonics current LCD Monitor MG32PS The EUT operated to produce the maximum harmonic components under normal operating conditions for each successive harmonic component in turn
10. The power consumption steady state harmonic currents were measured in the tested operating mode s The EUT measured in accordance with the test conditions described in Annex C C 10 Limits for Class D equipment Harmonic order Maximum permissible Maximum permissible harmonic current harmonic current per watt n mA W A 3 3 4 2 30 5 1 9 1 14 7 1 0 0 77 9 0 5 0 40 11 0 35 0 33 13 n s39 3 85 n See Table 1 odd harmonics only 4 3 1 Test instrumentation Test instrumentation used in the Harmonics current test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware Interval No Ver Date Month Power Analyzer PM6000 Voltech 100006700167 2007 10 12 12 IEC Network 555 ZIMMER IB10 9466 N A N A Test Software IEC1000 3 Voltech Ver 3 13 08 N A N A 27 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 4 3 2 Photograph of the test Configuration 28 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory LCD Monitor MG32PS en Project No LBE081805 LCD Monitor MG32PS er 4 3 3 Test results Operating condition PC Video In Analog _ Ping test Test date 2008 08 04 Test engineer Hyun Jeong Jang Ambient temperature 24 2 Relative humidity 40 96 Climate condition Atmospheric pressure 100 5 kPa
11. s8 Note 1 2L AX BL CL 1 LCD Panel Air 2 4 8X Note1xX 2L AX BL CL 2 Switch Air 2x 4 8 Note 1x 2L AX BL CL 3 AC In Air 2x 4 8 Note 1x 2L AX BL CL 4 RS232C In Out Contact 2X 4 s8 Note 1 2L AX BL CL 5 PC Audio In Contact 2X 4 8L Note1x 2L AX BO CL l 6 HDMI Contact 20 4 8 Note 1 2L AX BLE CLI Bi 7 PC Video In Contact z2D4 4 8 Note 1x 2L AX BL cH 8 DVI Input Contact 2X 4 s8 Note 1 2L AX BL CL 9 AV Out Contact 2X 4 s8 Note 1 2L AX BL CL 10 Audio In Contact 204 4 8L Note1x 2L AM BO CL 11 LAN Contact 20 s4D4 s8 Note 1x 2L AX BL CL 12 USB Port Contact 2 4 8 Note1x 2L AX BL cH NOTE 1 There was no change compared with initial operation during the test 2 While the electrostatic discharge tests malfunction appeared in normal operate but self recoverable after the test 45 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LCD Monitor MG32PS en 4 5 4 Tested points Bi Air discharge points Contact discharge points Air Contact discharge points m Front m Rear 1 46 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory FORY ACCRED 7 gt Kia gt Project No LBE081805 d LCD Moni
12. 1 4 1 1 Test instrumentation Test instrumentation used in the Conducted disturbance test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware Interval No Ver Date Month Test Software EMC 32 R amp S Ver 4 40 0 N A N A Measuring receiver ESCI R amp S 100368 2008 06 11 12 Artificial mains network ENV216 R amp S 100116 2007 09 13 12 9 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory RY ACCRED y gt 7 L Project No en amp LCD Monitor MG32PS 4 1 2 Photograph of the test Configuration Front 10 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory 4 1 3 Test results Operating condition Project No LBE081805 LCD Monitor MG32PS PC Video In Analog Ping test eater Test date 2008 07 31 Test engineer Hyun Jeong Jang Climate condition Ambient gd c Relative 40 Atmospheric 4997 kPa temperature humidity pressure Test place Shielded Room 1 QP Quasi peak AV Average Note Result Level QP or AV Corr LISN Insertion loss Cable loss Amplifier Gain Margin Limit Level Hardware Setup Voltage with ENV 2 Line LISN EMI conducted Subrange 1 Frequency Range 150kHz 30MHz Receiver ESCI 3 Transducer ENV216 Receiver 2 Line LISN ENV216
13. 1 2 50 8 20 Note 1 2 AL BL Modem Ports Earth l 1 1 2 50 8 20 Note1 20 AL BO d c power ports 0 5 1 2 50 8 20 Note 1 2 AL BL NOTE 1 There was no change compared with initial operation during the test 2 The transmission of data was stopped during the test but self recoverable after the test 58 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS en 4 9 Conducted disturbances induced by radio frequency fields The test was performed with the test generator connected to each of the coupling and decoupling devices in turn while the other non excited RF input ports of the coupling devices are terminated by a 50 ohm load resistor Attempts should be made to fully exercise the EUT during testing and to fully interrogate all exercise modes selected for susceptibility Test results are listed below The basic test procedure was in accordance with IEC 61000 4 6 Performance criteria Test range TOT Performance MHz Test specification CES 3 V unmodulated r m s 80 AM 1 kHz 1 The frequency range is scanned as specified However when specified in Annex A an additional comprehensive functional test shall be carried out ata limited number of frequencies The selected frequencies for conducted tests are 0 2 1 7 1 13 56 21 27 12 and 40 68 MHz 1 96 2 Applicable only to cables which according to
14. Adjusted Date 14 JUL 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None AC Source Mains Manual Source Harmonic Results Notes Against Chosen Limits Voltage Crest Factor outside permitted limits PASS Test Parameter Details User Entered Measured Operating Frequency 50 49 9840 Operating Voltage 230 230 2049 Specified Power 192 0000 189 7326 Fundamental Current 0 0000 0 8552 Power Factor 0 0000 0 9605 Average Input Current 0 8578 Maximum POHC 0 0059 POHC Limit 0 0826 Maximum THC 0 0701 Minimum Power 75 Class Multiplier 1 0000 Test Duration 00 02 30 33 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS MONITOR 2008 Aug 02 5 07pm Serial no None Page 1 of 1 Description Result Name HAR_HDMI Voltech IEC61000 3 Windows Software 1 10 04RC5 Test Date 2008 Aug 02 4 12pm Type of Test Fluctuating Harmonics Test Worst Case Table 2006 Power Analyzer Voltech PM6000 SN 100006700167 Firmware version v1 20 06RC3 Channel s 1 SN 090015500508 25 Adjusted Date 22 JUL 2007 2 SN 090015500521 25 Adjusted Date 23 JUL 2007 3 SN 090015500543 25 Adjusted Date 5 AUG 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None Shunt s 1 SN 091024300502 4 Adjusted Date 14 JUL 2007 2 SN 091
15. SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None AC Source Mains Manual Source Harmonic Results Notes Against Chosen Limits Voltage Crest Factor outside permitted limits PASS Test Parameter Details User Entered Measured Operating Frequency 50 49 9840 Operating Voltage 230 230 1991 Specified Power Fundamental Current Power Factor Average Input Current Maximum POHC POHC Limit Maximum THC Minimum Power Class Multiplier Test Duration 192 0000 0 0000 0 0000 75 1 0000 00 02 30 35 65 189 8328 0 8556 0 9606 0 8582 0 0061 0 0826 0 0708 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Product MONITOR 2008 Aug 02 5 07pm Serial no None Page 1 of 1 Description Result Name HAR_MAGICN Voltech IEC61000 3 Windows Software 1 10 04RC5 Test Date 2008 Aug 02 3 56pm Type of Test Fluctuating Harmonics Test Worst Case Table 2006 Power Analyzer Voltech PM6000 SN 100006700167 Firmware version v1 20 06RC3 Channel s 1 SN 090015500508 25 Adjusted Date 22 JUL 2007 2 SN 090015500521 25 Adjusted Date 23 JUL 2007 3 SN 090015500543 25 Adjusted Date 5 AUG 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None Shunt s 1 SN 091024300502 4 Adjusted Date 14 JUL 2007 2 SN
16. Scan Setup EN55022 B ENV 2 Line LISN fin EMI conducted Hardware Setup Voltage with ENV 2 Line LISN Level Unit dBuV Subrange Detectors IF Bandwidth Meas Time Receiver 150kHz 30MHz QuasiPeak Average 9kHz 15s ESCI 3 EN55022 B with ENV 2 Line LISN 80 70 60 EN 55022 B Voltage on Mains QP EN 55022 B Voltage on Mains AV Level in dBuV I 20 300 400 500 800 1M 2M 3M 4M 5M 6 Frequency in Hz 8 10M 20M 30M 11 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Final Measurement Detector 1 Frequency Quasi Peak Line Corr Margin Limit MHz dB y V dB dB dB y V 0 191 500 45 9 L1 9 6 18 1 64 0 0 213 500 42 4 N 9 6 20 7 63 1 0 304 500 46 2 N 9 6 13 9 60 1 0 361 500 43 3 N 9 6 15 4 58 7 0 427 500 44 7 N 9 6 12 6 57 3 0 510 500 50 3 N 9 6 5 7 56 0 0 541 500 52 1 N 9 6 3 9 56 0 0 611 500 42 9 L1 9 6 13 1 56 0 0 818 500 35 9 L1 9 7 20 1 56 0 0 941 500 34 9 L1 9 7 21 1 56 0 Final Measurement Detector 2 Frequency Average Line Corr Margin Limit MHz dB y V dB dB dB x V 0 320 500 30 5 N 9 6 19 1 49 7 0 429 500 27 3 N 9 6 19 9 47 3 0 510 500 41 2 N 9 6 4 8 46 0 0 576 500 41 6 N 9 6 4 4 46 0 0 822 500 26 9 L1 9 7 19 1 46 0 1 174 500 26 7 L1 9 7 19 3 46 0 1 409 500 25 7 L1 9 7 20 3 46 0 1 6
17. Test place Shielded Room 3 Product MONITOR 2008 Aug 02 5 07pm Serial no None Page 1 of 1 Description Test Date 2008 Aug 02 4 06pm Result Name HAR_PC Type of Test EN61000 2006 Harmonics inc interharmonics to EN61000 4 7 2002 Limits Class D Power Analyzer Voltech PM6000 SN 100006700167 Firmware version v1 20 06RC3 Channel s 1 SN 090015500508 25 Adjusted Date 22 JUL 2007 2 SN 090015500521 25 Adjusted Date 23 JUL 2007 3 SN 090015500543 25 Adjusted Date 5 AUG 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None Shunt s 1 SN 091024300502 4 Adjusted Date 14 JUL 2007 2 SN 091024300503 4 Adjusted Date 14 JUL 2007 3 SN 091024300504 4 Adjusted Date 14 JUL 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None AC Source Mains Manual Source Harmonic Results Notes Against Chosen Limits Voltage Crest Factor outside permitted limits PASS Test Parameter Details User Entered Measured Operating Frequency 50 49 9840 Operating Voltage 230 230 2034 Specified Power 192 0000 189 7964 Fundamental Current 0 0000 0 8555 Power Factor 0 0000 0 9606 Average Input Current 0 8582 Maximum POHC 0 0060 POHC Limit 0 0826 Maximum THC 0 0701 Minimum Power 75 Class Multiplier 1 0000 Test Duration 00 02 30 29 65 This report must not be reproduced except in full without written permission fr
18. dmax 96 d t 3 396 ms Limit 4 000 Reading 1 0 412 0 39 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Lm Operating condition HDMI to DVI connected Ping test Test date 2008 08 04 Test engineer Hyun Jeong Jang Ambient temperature 24 2 Relative humidity 40 96 Climate condition Atmospheric pressure 100 5 kPa Test place Shielded Room 3 Product MONITOR 2008 Jul 29 10 47am Serial no None Description Result Name FLI_LHDMI Voltech IEC61000 3 Windows Software 1 10 04RC5 Test Date 2008 Jul 29 9 14am Type of Test Flickermeter Test Table Power Analyzer Voltech PM6000 SN 100006700167 Firmware Version v1 20 06RC3 Channel s 1 SN 090015500508 25 Adjusted Date 22 JUL 2007 2 SN 090015500521 25 Adjusted Date 23 JUL 2007 3 SN 090015500543 25 Adjusted Date 5 AUG 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None Shunt s 1 SN 091024300502 4 Adjusted Date 14 JUL 2007 2 SN 091024300503 4 Adjusted Date 14 JUL 2007 3 SN 091024300504 4 Adjusted Date 14 JUL 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None AC Source Mains Manual Source Overall Result Notes Measurement method Voltage PASS dc 96 dmax 96 d t gt 3 3 ms Limit 3 300 4 000
19. method Voltage PASS dc 96 dmax 96 d t gt 3 3 ms Limit 3 300 4 000 500 Reading 1 0 002 0 403 0 38 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Lm Operating condition DVI Input Digital Ping test Test date 2008 08 04 Test engineer Hyun Jeong Jang Ambient temperature 24 2 Relative humidity 40 96 Climate condition Atmospheric pressure 100 5 kPa Test place Shielded Room 3 Product MONITOR 2008 Jul 29 10 47am Serial no None Description Result Name FLI_DIGITAL Voltech IEC61000 3 Windows Software 1 10 04RC5 Test Date 2008 Jul 29 9 56am Type of Test Flickermeter Test Table Power Analyzer Voltech PM6000 SN 100006700167 Firmware Version v1 20 06RC3 Channel s 1 SN 090015500508 25 Adjusted Date 22 JUL 2007 2 SN 090015500521 25 Adjusted Date 23 JUL 2007 3 SN 090015500543 25 Adjusted Date 5 AUG 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None Shunt s 1 SN 091024300502 4 Adjusted Date 14 JUL 2007 2 SN 091024300503 4 Adjusted Date 14 JUL 2007 3 SN 091024300504 4 Adjusted Date 14 JUL 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None AC Source Mains Manual Source Overall Result Notes Measurement method Voltage PASS
20. point for each such area The EUT was tested with all I O ports exercised Test results are listed below The basic test procedure was in accordance with IEC 61000 4 2 Performance criteria Application of discharge qal BE Performance criteria Contact discharge 4 B Air Discharge 8 B 4 5 1 Test instrumentation Test instrumentation used in the Electrostatic discharge test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware Interval No Ver Date Month ESD Gun NSG435 SCHAFFNER 001506 2008 03 27 12 Vertical Plane VCP 1 Thermo Keytek 43 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 4 5 2 Photograph of the test Configuration 44 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory LCD Monitor MG32PS en Project No LBE081805 LCD Monitor MG32PS Lm 4 5 3 Test results Operating condition PC Video In Analog Test date 2008 08 04 Test engineer Hyun Jeong Jang Ee CMT Ambient temperature 24 0 Relative humidity 56 96 Atmospheric pressure 100 5 kPa Test place Shielded Room 3 ee d No Applied Point eiie Test Level KV EINER NES iic indici i HCP Contact 2 4 8 Note 1 2L AX BO CLI VCP Contact 2X 40
21. power supply outlet to which the EUT is to be connected E Test on I O and communication ports As far as possible the capacitive coupling clamp is used for coupling the test voltage into the lines However if the clamp cannot be used due to mechanical problems size cable routing in the cabling it may be replaced by a tape or a conductive foil enveloping the lines under test The capacitance of this coupling arrangement with foil or tape is equivalent to that of the standard coupling clamp In other cases it is useful to couple the EFT B generator to the terminals of the lines via discrete 100 pF capacitors instead of the distributed capacitance of the clamp or of the foil or tape arrangement All tests carried out in shielded room The EUT was tested with all I O ports exercised Test results are listed below Performance criteria Applied conditions Test specification Performance criteria Open circuit output test voltage a c power ports 1 kV Peak signal and telecommunication ports 0 5 kV Peak d c power ports 0 5 kV Peak B Wave shape of the pulse 5 50 Tr Th ns Repetition Frequency 5 kHz 51 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Lm 4 7 1 Test conditions Test condition in the Electrical fast transient burst immunity test was as follows Representative operating conditio
22. pressure 100 7kPa Test Voltage Period phi Angle Observation Performance 9 an Degrees Note No Result Applications 295 UT 0 5 10 0 180 Note 1E 2 AM BO cO 30 UT 25 10 0 Note 1x 2 AK BOU Cl 295 UT 250 10 0 Note 1 2X AL BK cH NOTE 1 There was no change compared with initial operation during the test 2 While The Voltage Dip amp Interruption tests malfunction appeared in normal operate but self recoverable after the test 64 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No Appendix EUT photography Front View Rear View 65 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory LCD Monitor MG32PS en
23. 02 0 406 41 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS er Operating condition Manual Switching Test date 2008 08 04 Test engineer Hyun Jeong Jang Ambient temperature 24 2 Relative humidity 40 96 Climate condition Atmospheric pressure 100 5 kPa Test place Shielded Room 3 Product MONITOR 2008 Aug 04 6 42pm Serial no None Page 1 of 1 Description Result Name MANUAL SWITCHING Type of Test Manual Switching Table Power Analyzer Voltech PM6000 SN 100006700167 Firmware Version v1 20 06RC3 Channel s 1 SN 090015500508 25 Adjusted Date 22 JUL 2007 2 SN 090015500521 25 Adjusted Date 23 JUL 2007 3 SN 090015500543 25 Adjusted Date 5 AUG 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Dale None Shunt sy 1 SN 091024300502 4 Adjusted Date 14 JUL 2007 2 SN 091024300503 4 Adjusted Date 14 JUL 2007 3 SN 091024300504 4 Adjusted Date 14 JUL 2007 4 SN None Adjusted Date None 5 SN None Adjusted DateNone 6 SN None Adjusted Date None AC Source Mains Manual Source Overall Result Notes Measurement method Voltage PASS Average dmax 1 386 dmax pass fail included 0 000 1 619 Pass 0 000 0 735 Pass Y 0 000 1 709 Pass 0 000 2 116 16 i 899 183 ss 3 0 104 0 000 0 902 Pass NA 0 104 0 000 2 538 Pa
24. 024300503 4 Adjusted Date 14 JUL 2007 3 SN 091024300504 4 Adjusted Date 14 JUL 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None AC Source Mains Manual Source Overall Result Notes Voltage Crest Factor outside permitted limits PASS Class Class Multiplier Limit 1 Limit 2 Average Max Limit 1 Limit2 Average Max Reading Reading Reading Reading 0 723mA 0 797mA 652 8mA 979 2mA 52 68mA 52 82mA 0 493mA 0 558mA 364 8mA 547 2mA 27 80mA 27 84mA 0 459mA 0 492mA 192 0mA 288 0mA 25 80mA 25 90mA 0 313mA 0 467mA 96 00mA 144 0mA 18 50mA 18 60mA 0 484mA 0 523mA 67 19mA 100 7mA 13 01mA 13 05mA 0 332mA 0 367mA 56 86mA 85 29mA 8 294mA 8 331mA 0 352mA 0 381mA 49 27mA 73 91mA 5 068mA 5 133mA 0 249mA 0 285mA 43 48mA 65 22mA 4 969mA 5 031mA 0 231mA 0 261mA 38 90mA 58 35mA 3 851mA 3 890mA 0 285mA 0 312mA 35 20mA 52 79mA 2 020mA 2 051mA 0 242mA 0 272mA 32 13mA 48 20mA 0 658mA 0 698mA 0 504mA 0 536mA i 29 56mA 44 35mA 0 946mA 0 988mA 0 205mA 0 225mA 27 37mA 41 06mA 0 912mA 0 937mA 0 186mA 0 206mA 2548mA 3823mA 1 731mA 1 766mA 0 212mA 0 232mA 23 84mA 35 76mA 2 662mA 2 700mA KARR RRR RRR KKK KR RRR RRR KRRKRKR RRR RRR 0 230mA 0 255mA 22 40mA 33 59mA 2 750mA 2 778mA 0 234mA 0 265mA 21 12mA 31 68mA 2477mA 2 510mA 0 212mA 0 234mA 19 97mA 29 96mA
25. 091024300503 4 Adjusted Date 14 JUL 2007 3 SN 091024300504 4 Adjusted Date 14 JUL 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None AC Source Mains Manual Source Overall Result Notes Voltage Crest Factor outside permitted limits PASS Class Class Multiplier Limit 1 Limit 2 Average Max Limit 1 Limit 2 Average Max Reading Reading Reading Reading 1 117mA 1 199mA 652 8mA 979 2mA 52 57mA 52 91mA 0 458mA 0 510mA 364 8mA 547 2mA 27 73mA 28 11mA 0 430mA 0 495mA 192 0mA 288 0mA 25 83mA 26 31mA 0 274mA 0 439mA 96 00mA 144 0mA 18 47mA 18 93mA 0 467mA 0 517mA 67 19mA 100 7mA 13 03mA 13 38mA 0 349mA 0 383mA 56 86mA 85 29mA 8 380mA 8 708mA 0 369mA 0 398mA 4927mA 73 91mA 5 131mA 5 432mA 0 248mA 0 276mA 43 48mA 65 22mA 4 967mA 5 236mA 0 290mA 0 325mA 38 90mA 58 35mA 3 822mA 4 029mA 0 310mA 0 341mA 35 20mA 52 79mA 2 057mA 2 239mA 0 234mA 0 261mA 32 13mA 48 20mA 0 652mA 0 813mA 0 501mA 0 532mA 29 56mA 44 35mA 0 933mA 1 058mA 0 216mA 0 237mA 27 37mA 41 06mA 0 909mA 0 991mA 0 202mA 0 235mA 25 48mA 38 23mA 1 722mA 1 791mA 0 224mA 0 254mA 23 84mA 35 76mA 2 673mA 2 730mA 0 252mA 0 275mA 22 40mA 33 59mA 2 767mA 2 795mA 0 253mA 0 283mA 21 12mA 31 68mA 2478mA 2 510mA 0 196mA 0 220mA i 19 97mA 29 96mA 1 817mA 1 853mA NNKSESESESESESES
26. 298mA 0 512mA 0 329mA 0 541mA 0 270mA 0 259mA re ee ee Fasc nen 0 244mA 0 241mA 0 197mA None None None None s e re L1 Reading is below limit 1 L2 Reading is below limit 2 N A Harmonic current below 0 6 of rated current or 5mA whichever is greater are disregarded 0 208mA 32 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS en Operating condition HDMI to DVI connected Test date 2008 08 04 Test engineer Hyun Jeong Jang Ambient temperature 24 2 C Relative humidity 40 Climate condition Atmospheric pressure 100 5 kPa Test place Shielded Room 3 Product MONITOR 2008 Aug 02 5 07pm Serial no None Page 1 of 1 Description Test Date 2008 Aug 02 4 12pm Result Name HAR_HDMI Type of Test EN61000 2006 Harmonics inc interharmonics to EN61000 4 7 2002 Limits Class D Power Analyzer Voltech PM6000 SN 100006700167 Firmware version v1 20 06RC3 Channel s 1 SN 090015500508 25 Adjusted Date 22 JUL 2007 2 SN 090015500521 25 Adjusted Date 23 JUL 2007 3 SN 090015500543 25 Adjusted Date 5 AUG 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None Shunt s 1 SN 091024300502 4 Adjusted Date 14 JUL 2007 2 SN 091024300503 4 Adjusted Date 14 JUL 2007 3 SN 091024300504 4
27. 3 1995 A1 Flicker 2001 A2 2005 Compiled 1 2 Immunity Immunity test applied the normative documents of EN55024 1998 A1 2001 A2 2003 The EUT has been tested according to the following specifications Performance Criterion Applied Test type Applied standard Result Specification px Electrostatic discharge EN61000 4 2 1995 AX BL CL B Radiated radio frequency FELT Ed electromagnetic field ENG1000 4 3 1995 Abd BLI cL i px Electrical fast transient burst EN61000 4 4 1995 Ax BL CL B px Surge EN61000 4 5 1995 AX BL CL B px Radio frequency conducted EN61000 4 6 1996 AX BL CL A AX BL CL Voltage dips short B gt 95 0 5 Reduction X interruptions and voltage EN61000 4 11 1994 AX BL CL C 30 25 Reduction variations C gt 95 250 Reduction AL BX CL oO iiic a magnetic EN61000 4 8 1993 AO BO CL A 3 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory ORY ACCRED 74 Q RN o M 4 Project No LBE081805 LCD Monitor MG32PS 2 General Information 2 1 Test facility The SEC EMC Laboratory is located on Samsung Electronics Co Ltd at 416 Maetan 3 Dong Yeongtong Gu Suwon Si Gyeonggi Do South Korea All testing are performed in Semi anechoic chambers conforming to the site attenuation Characteristics defined by ANSI C63 4 CISPR 22 16 1 and 16 2 and Shielded rooms The S
28. 3 L1 9 7 20 7 56 0 Final Measurement Detector 2 Frequency Average Line Corr Margin Limit MHz dB y V dB dB dB uv V 0 320 500 30 9 N 9 6 18 8 49 7 0 431 500 27 6 N 9 6 19 6 47 2 0 510 500 41 1 N 9 6 4 9 46 0 0 576 500 41 9 N 9 6 4 1 46 0 0 824 500 27 4 L1 9 7 18 6 46 0 1 178 500 26 8 L1 9 7 19 2 46 0 1 414 500 26 4 L1 9 7 19 6 46 0 1 649 500 26 5 L1 9 7 19 5 46 0 2 119 500 25 6 L1 9 7 20 4 46 0 2 120 500 254 N 9 7 20 6 46 0 16 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS en Operating condition Magic Network _ Ping test Test date 2008 07 31 Test engineer Hyun Jeong Jang Climate condition ambient PO c ees 40 Atmospheric 409 7 pa temperature humidity pressure Test place Shielded Room 1 QP Quasi peak AV Average Note Result Level QP or AV Corr LISN Insertion loss Cable loss Amplifier Gain Margin Limit Level Hardware Setup Voltage with ENV 2 Line LISN EMI conducted Subrange 1 Frequency Range 150kHz 30MHz Receiver ESCI 3 Transducer ENV216 Receiver 2 Line LISN ENV216 Scan Setup EN55022 B ENV 2 Line LISN fin EMI conducted Hardware Setup Voltage with ENV 2 Line LISN Level Unit dBuV Subrange Detectors IF Bandwidth Meas Time Receiver 150kHz 30MHz QuasiPeak Average 9kHz 15s ESCI 3 EN55022 B with ENV 2 Line LISN 80 70
29. 4 Position of the radiating antennas a distance of 3 meters from the EUT 5 Type of antennas Log periodic 6 Frequency sweep rate 1 5 x 10 3 decades s 7 Dwell time and frequency steps Dwell time 3 s Step size 1 96 8 Applied test level 3 V m 48 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Lm 4 6 2 Test instrumentation Test instrumentation used in the Radiated radio frequency and electromagnetic field test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware No Ver date Interval Mast Controller CO2000 INNCO N A Sinal Generator SMLO3 R amp S 102191 2007 09 07 12 Milivolt Meter URV5 R amp S 100243 2008 04 07 12 10V Insertion Unit URV5 Z2 R amp S 100240 2008 04 07 12 10V Insertion Unit URV5 Z2 R amp S 100241 2008 04 07 12 Amplifier 250W1000A AR 312241 N A N A Amplifier 60SIG3 AR 311853 N A N A Antenna AT1080 AR 310700 N A N A Antenna Mast TP1000A AR 311200 N A N A Relay Switching Unit TS RSP AR N A N A 4 6 2 Photograph of the test Configuration 49 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Lm 4 6 3 Test results Test date 2008 08 05 Hyun Jeong Jang
30. 4 C Relative humidity 4296 Climate condition Atmospheric pressure 101 0 kPa Test place 10m Semi Anechoic Chamber 2 Receiving antenna mode Horizontal Vertical Test distance 10 m RF Semi Anechoic Chamber Result Reading c f Antenna factor Cable loss Amp Gain Margin Limit Result Note SAMSUNG Radiated Emission gt gt 24 July 2008 09 13 R4 10m Chamber 2 DVI dat Model Standard CISPR Pub 22 Class B 10m Serial Remark1 Remark2 Remark3 Remark4 dB uV m 60 10m CISPRB Limit lt DVI gt Spectrum H PK Spectrum V PK Suspected Item H Suspected Item V Final Item H QP Final Item V QP Frequency Final Result Horizontal Polarization QP No Frequency ing c f Result Limit MHz dB 1 m dB uV m dB uV m 160 025 4 19 3 s I 500 019 1 2 3 513 079 4 633 356 Vertical Polarization QP No Frequency Reading o f Result MHz dB uV d8 1 m dB uv m dB uV m 1 54 470 40 2 23 4 16 8 30 0 2 169 515 37 4 19 1 18 3 30 0 3 198 912 34 5 18 9 15 6 30 0 4 256 548 41 2 15 0 26 2 24 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS er Operating condition HDMI to DVI connected _ Ping test Test date 2008 07 30 Test engineer Hyun Jeong Jang Ambient temp
31. 45 500 25 2 N 9 7 20 8 46 0 2 116 500 25 0 L1 9 7 21 0 46 0 3 179 500 23 1 L1 9 8 22 9 46 0 12 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS en Operating condition DVI Input Digital Ping test Test date 2008 07 31 Test engineer Hyun Jeong Jang Climate condition PURSE Bid o Selve 40 Atmospheric 1557 kPa temperature humidity pressure Test place Shielded Room 1 QP Quasi peak AV Average Note Result Level QP or AV Corr LISN Insertion loss Cable loss Amplifier Gain Margin Limit Level Hardware Setup Voltage with ENV 2 Line LISN EMI conducted Subrange 1 Frequency Range 150kHz 30MHz Receiver ESCI 3 Transducer ENV216 Receiver 2 Line LISN ENV216 Scan Setup EN55022 B ENV 2 Line LISN fin EMI conducted Hardware Setup Voltage with ENV 2 Line LISN Level Unit dBuV Subrange Detectors IF Bandwidth Meas Time Receiver 150kHz 30MHz QuasiPeak Average 9kHz 15s ESCI 3 EN55022 B with ENV 2 Line LISN 80 70 60 EN 55022 B Voltage on Mains QP EN 55022 B Voltage on Mains AV ene SI He ea GG Me 9 Cc o rT MUT Lu Level in dBuV 20 150k 300 400 500 800 1M 2M 3M 4M 5M 6 8 10M 20M 30M Frequency in Hz 13 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory
32. 7 USB Keyboard 1 5 N 8 USB Mouse 1 5 N 9 USB Mouse 1 0 Y 10 USB Mouse 1 0 Y 11 USB Mouse 1 0 Y 12 PC Audio In 1 5 Y 13 LAN 2 0 Y 14 A V Out 1 0 N 15 Audio In 1 0 N 16 RS232C IN 1 5 Y 17 RS232C OUT 1 5 Y 18 USB Printer 1 0 N 3 5 EUT Description The following features describe EUT represented by this report Items Description Optimum Resoultion 1360 x 768 60Hz Maximum Resolution 1360 x 768 60Hz Horizontal Frequency kHz 30 70KHz Vertical Frequency Hz 50 85Hz 6 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Lm 3 6 Description of the EUT exercising method The EUT exercise program used during EMI and Immunity EMS testing was the SEC EMC Laboratory standardized test program for MS Windows The program repetitively sends a screen of H Character to the display Connect video output of computer on EUT s PC IN D sub port and scrolled H character continuously on EUT s screen Also when EUT has loudspeaker it was regenerative through EUT s audio input reproducing digital white noise by MS Windows Media player in computer 3 7 Performance Criteria Performance criterion A The equipment shall continue to operate as intended without operator intervention No degradation of performance or loss of function is allowed below a performance level specifi
33. EC EMC Laboratory is operated as testing laboratory in accordance with the requirements of ISO IEC 17025 2005 2 2 Accreditation and listing Laboratory Qualifications Remarks KOLAS Korea Laboratory Accreditation Scheme Accredited 124 Radio Research Laboratory Accredited KR0004 FCC Federal Communications Commission Accredited KRO0004 National Voluntary Laboratory Accreditation Program Lab Code 200623 0 Norges Elektriske Materiellkontroll Accredited ELA 195 VCCI Voluntary Control Council for Interference by D k vel Information Technology Equipment Ceu ea A Caec China Quality Certification Center 5 053 5 054 e S A TUV Rhineland H9354285 cs GOST GOSTSTANDART ROSTEST Deme Elektrotechnicky Zkusebni Ustav Reg No 001 iwi Industry T Canada IC Industry Canada 4 65 Assigned Code 5871 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Lm 3 Test Setup configuration 3 1 Test Peripherals The cables used for these peripherals are either permanently attached by the peripheral manufacturer or coupled with an assigned cable as defined below The following is a listing of the EUT and peripherals utilized during the performance of EMC test Description Model No Serial No Manufacturer Note LCD Monitor MG32PS Samsung EUT
34. EMC TEST REPORT Project No LBE081805 Revision No NONE Name of organization Samsung Electronics Co Ltd 416 Maetan 3 Dong Yeongtong Gu Suwon Si Applicant Address Gyeonggi Do 443 742 Korea Date of application 2008 05 30 Kind of product LCD Monitor MG32PS Model No EUT Variant Model No NONE Equipment New Alternative Under Test Permissive change New information Samsung Electronics Co Ltd Manufacturer 416 Maetan 3 Dong Yeongtong Gu Suwon Si Gyeonggi Do 443 742 Korea EN55022 1998 A1 2000 A2 2003 EN55024 1998 A1 2001 A2 2003 EN61000 3 2 2000 A2 2005 EN61000 3 3 1995 A1 2001 A2 2005 Issue date 2008 07 31 Test result Complied Applied Standards The equipment under test has found to be compliant with the applied standards Refer to the attached test result for more detail Tested by Hyun Jeong Jang Reviewed by No Cheon Park ERE d d This report is the test result about the sphere accredited by KOLAS which signed the Mutual Recognition Arrangement of International Laboratory Accreditation Cooperation The test results in this report only apply to the tested sample This report must not be reproduced except in full without written permission from SEC EMC Laboratory 416 Maetan 3 Dong Yeongtong Gu Suwon Si Gyeonggi Do 443 742 Korea Tel 82 31 277 7752 Fax 82 31277 7753 1 65 S OR EE Project No LBE081805 LCD Monitor MG32PS en Table of contents 1 Summary of test results
35. ESESESRSRSRR KK RRR RRR RRR RRK 0 197mA 0 217mA 18 95mA 28 43mA 1 275mA 1 313mA NNE amp KESSESESSERESEESESRSRSRSRR 0 209mA 0 231mA L1 Reading is below limit 1 L2 Reading is below limit 2 N A Harmonic current below 0 696 of rated current or 5mA whichever is greater are disregarded 36 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS en 4 4 Voltage fluctuation amp Flicker The EUT operated to produce the most unfavorable sequence of voltage changes under normal operating conditions During the flicker measurement the measure time shall include that part of whole operation cycle in which the EUT produce the most unfavorable sequence of voltage changes Limits of voltage fluctuations and flicker at the supply terminals short termflleker the relative the value of d t during a the maximum indicator Pst steady state voltage voltage change d t relative voltage i change dc 23 3 96 change dmax 3 3 4 4 4 1 Test instrumentation Test instrumentation used in the Voltage fluctuation amp Flicker test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware Interval No Ver Date Month Power Analyzer PM6000 Voltech 100006700167 2007 10 12 12 IEC Network 555 ZIMMER IB10 9466 N A N A Test Software IEC1000 3 V
36. Level QP or AV Corr LISN Insertion loss Cable loss Amplifier Gain Margin Limit Level Hardware Setup Voltage with ENV 2 Line LISN EMI conducted Subrange 1 Frequency Range 150kHz 30MHz Receiver ESCI 3 Transducer ENV216 Receiver 2 Line LISN ENV216 Scan Setup EN55022 B ENV 2 Line LISN fin EMI conducted Hardware Setup Voltage with ENV 2 Line LISN Level Unit dBuV Subrange Detectors IF Bandwidth Meas Time Receiver 150kHz 30MHz QuasiPeak Average 9kHz 15s ESCI 3 EN55022 B with ENV 2 Line LISN 80 70 60 EN 55022 B Voltage on Mains QP 50 d Nd EN 55022 B Voltage on Mains AV E gt oie o 1 i 40 ar Af xo VA e V E 1 30 r d 20 10 0 150k 300 400 500 800 1M 2M 3M 4M 5M 6 8 10M 20M 30M Frequency in Hz 15 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Final Measurement Detector 1 Frequency Quasi Peak Line Corr Margin Limit MHz dB y V dB dB dB y V 0 191 500 45 8 L1 9 6 18 1 64 0 0 306 500 45 6 N 9 6 14 4 60 1 0 352 500 43 3 N 9 6 15 6 58 9 0 433 500 44 5 N 9 6 12 7 57 2 0 512 500 50 1 N 9 6 5 9 56 0 0 549 500 52 7 N 9 6 3 3 56 0 0 617 500 41 1 L1 9 6 14 9 56 0 0 752 500 36 3 L1 9 7 19 7 56 0 0 943 500 34 9 L1 9 7 21 1 56 0 1 176 500 35
37. PC DM V65 156X96BP600169L Samsung USB Keyboard SEM DT35 40037574 Samsung USB Mouse M SBF69 HCA53112273 Samsung USB Mouse MS201U 69G0536 Samsung USB Mouse MS201U 69G0513 Samsung USB Mouse MS201U 69G1500 Samsung 3 2 EUT operating mode To achieve compliance applied standard specification the following mode s were made during compliance testing Operating Mode 1 PC Video In Analog Operating Mode 2 DVI Input Digital Operating Mode 3 DVI to HDMI Connected Operating Mode 4 Magic Network 3 3 Details of Sampling Customer selected single unit 5 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Lm 3 4 Used cable description The EUT is configured installed arranged and operated in a manner consistent with typical applications Interface cables loads devices are connected to at least one of each type of interface port of the EUT and where practical each cable shall be terminated in a device typical of actual usage The type s of interconnecting cables to be used and the interface port of the EUT to which these were connected No Connect Cable Length m Ferrite core Y N Remark 1 Power 1 8 N For EUT 2 Power 1 8 N For PC 3 Power 1 8 N For Printer 4 PC Video In Analog 1 5 N 5 DVI Input Digital 1 5 N 6 DVI to HDMI 1 5 Y
38. Test instrumentation Test instrumentation used in the Radiated disturbance was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware o S ked No Ver Date No Month EMI Test Receiver ESIB 26 R amp S 832692 002 2008 03 18 12 EMI Test Receiver ESIB 26 R amp S 100290 2008 03 27 12 Ant Mast MA4000 inn co N A N A Ant Mast MA4000 inn co N A N A Mast Controller CO2000 inn co N A N A Amplifier 310N SONOMA 251674 2008 03 13 12 Amplifier 310N SONOMA 186465 2008 04 09 12 RF selector NS4900 inn co N A N A RF selector NS4900 inn co N A N A Bi log Antenna CBL6112D SCHAFFNER 22248 2007 10 18 24 Bi log Antenna CBL6112D SCHAFFNER 22603 2007 04 02 24 21 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No 4 2 2 Photograph of the test Configuration Front m Ja amp LLAT 4 E Bh 8I 1 1144 0 Bb EL 11 2 4L ENG LLL aad 22 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory LCD Monitor MG32PS umm Project No LBE081805 LCD Monitor MG32PS er 4 2 3 Test results Operating condition PC Video In Analog _ Ping test Test date 2008 07 30 Test engineer Hyun Jeong Jang Ambient temperature 23 4 Relative humidity 4296 Climate condition Atmospheric pressure 101 0 kPa Test
39. Y ACCRE S Ora gt A E ez Product Serial no Description Result Name Project No LBE081805 LCD Monitor MG32PS MONITOR None 2008 Aug 02 6 07pm Page 1 of 1 HAR_DVI Voltech IEC61000 3 Windows Software 1 10 04RC5 Test Date 2008 Aug 02 4 20pm Type of Test Power Analyzer AC Source Overall Result PASS Limit 1 Limit 2 None None None Fluctuating Harmonics Test Worst Case Table 2006 Voltech PM6000 SN 100006700167 Firmware version v1 20 06RC3 Channel s 1 SN 090015500508 25 Adjusted Date 22 JUL 2007 3 SN 090015500543 25 Adjusted Date 5 AUG 2007 5 SN None Adjusted Date None Shunt s 1 SN 091024300502 4 Adjusted Date 14 JUL 2007 3 SN 091024300504 4 Adjusted Date 14 JUL 2007 5 SN None Adjusted Date None 2 SN 090015500521 25 Adjusted Date 23 JUL 2007 4 SN None Adjusted Date None 6 SN None Adjusted Date None 2 SN 091024300503 4 Adjusted Date 14 JUL 2007 4 SN None Adjusted Date None 6 SN None Adjusted Date None Mains Manual Source Notes Average Reading 1 072mA Pass arm Limit 1 Limit 2 Reading FAIL LN ES REN SEES Voltage Crest Factor outside permitted limits Average L1 12 Max lt L2 Pass Reading Reading FAIL zo yy neal y om None 0 410mA 0 439mA 0 456mA 0 478mA 0 518mA 0 508mA 0 367mA 0 315mA 0 405mA 0 490mA 0 388mA 19mA 56 86mA 85 26mA 0 269mA 0 286mA 0
40. ed by the manufacturer when the equipment is used as intended The performance level may be replaced by a permissible loss of performance If the minimum performance level or the permissible performance loss is not specified by the manufacturer then either of these may be derived from the product description and documentation and by what the user may reasonably expect from the equipment if used as intended Performance criterion B After the test the equipment shall continue to operate as intended without operator intervention No degradation of performance or loss of function is allowed after the application of the phenomena below a performance level specified by the manufacturer when the equipment is used as intended The performance level may be replaced by a permissible loss of performance During the test degradation of performance is allowed However no change of operating state or stored data is allowed to persist after the test If the minimum performance level or the permissible performance loss is not specified by the manufacturer then either of these may be derived from the product description and documentation and by what the user may reasonably expect from the equipment if used as intended Performance criterion C Loss of function is allowed provided the function is self recoverable or can be restored by the operation of the controls by the user in accordance with the manufacturer s instructions Functions and or informat
41. elded symmetrically operated interconnection telecommunication lines L shielded lines L potential differences 3 the type of test facility Shielded Room 3 4 Test level L 0 5 kV X1kv X 2kvV 5 Polarity of the surge X Positive xX Negative 6 Number of test at selected points 40 7 Repetition rate 60 sec x Live Neutral a c power ports P E DX Live PE X Neutral PE 8 EUT s ports to be tested C 1O ports others ports L Communication ports L d c power ports 56 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory ED Project No LBE081805 e e mmu LCD Monitor MG32PS en 4 8 3 Photograph of the test Configuration 57 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS er 4 8 4 Test results Test date 2008 08 02 Hyun Jeong Jang Ambient temperature 24 0 C Relative humidity 56 96 Climate condition Atmospheric pressure 100 1 kPa USES SUEDE WEN Observation Performance Test Point Polarity Level Shape Note No Result kV us Live PE 2 1 2 50 8 20 Note 1X 2 AM BI a c ons Neutral PE 2 1 2 50 8 20 Note 1x 2 AX BU Live Neutral 1 1 2 50 8 20 Note 1k 2L AX BL I O Ports l 1 1 2 150 8 20 Note10 20 AL BO LAN Ports Line to 1
42. erature 23 4 Relative humidity 4296 Climate condition Atmospheric pressure 101 0 kPa Test place 10m Semi Anechoic Chamber 2 Receiving antenna mode Horizontal Vertical Test distance 10 m RF Semi Anechoic Chamber Result Reading c f Antenna factor Cable loss Amp Gain Margin Limit Result Note SAMSUNG lt lt Radiated Emission gt gt 24 July 2008 10 53 R4 10m Chamber 2 HDMI dat Model Standard CISPR Pub 22 Class B 10m Serial Remark1 Operator Remark2 AC Power Remark3 Temp Humidity Remark4 dB uV m 60 10m CISPRB Limit L lt HDMI gt 50 L Spectrum H PK L Spectrum V PK Suspected Item H Suspected Item V Final Item H QP Final Item V QP Frequency Final Result Horizontal Polarization QP No Frequency Reading c f Result MHz dB uV dB 1 m dB uV m 1 250 007 45 0 15 9 29 1 2 427 536 38 4 10 3 3 500 033 35 2 9 0 4 633 384 35 7 7 1 Vertical Polarization QP No Frequency Reading MHz dB uV 46 35 4 1 2 3 500 033 4 930 961 25 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS er Operating condition Magic Network _ Ping test Test date 2008 07 30 Test engineer Hyun Jeong Jang Ambient temperature 23 4
43. g Jang Climate condition PURSE diac Rees 40 Atmospheric 409 7 pa temperature humidity pressure Test place Shielded Room 1 QP Quasi peak AV Average Note Result Level QP or AV Corr LISN Insertion loss Cable loss Amplifier Gain Margin Limit Level Hardware Setup ISN T400A Cat5 EMI conducted Subrange 1 Frequency Range 150kHz 30MHz Receiver ESCI 3 Transducer ISN T400A Cat5 Receiver 2 Line LISN ENV216 Scan Setup EN55022 B T400A Cat5 ISN fin EMI conducted Hardware Setup ISN T400A Cat5 Level Unit dBuV Subrange Detectors IF Bandwidth Meas Time Receiver 150kHz 30MHz QuasiPeak Average 9kHz 5s ESCI 3 EN55022 B with T400A Cat5 100M ISN 100 90 Class B_QP Class_B_AV Level in dBuV 150k 300 400 500 800 1M 2M 3M 4M 5M 6 8 10M 20M 30M Frequency in Hz 19 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Final Measurement Detector 1 Frequency Quasi Peak Corr Margin Limit MHz dB y V dB dB dB u V 13 359 500 60 6 9 5 13 4 74 0 13 419 500 60 8 9 5 13 2 74 0 13 480 500 59 9 9 5 14 1 74 0 16 167 500 60 1 9 6 13 9 74 0 16 228 500 61 3 9 6 12 7 74 0 18 244 500 59 1 9 6 14 9 74 0 23 129 500 61 4 9 6 12 6 74 0 29 236 500 59 9 9 7 14 1 74 0 Final Measurement Detect
44. ion stored in non volatile memory or protected by a battery backup shall not be lost 7 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS 3 8 Measurement uncertainty Where relevant the following measurement uncertainty levels have been estimated for tests performed on the apparatus According to CISPR 16 4 and UKAS Lab 34 3 8 1 Emission Test type Measurement uncertainty yp C L 95 k 2 Conducted disturbance 2 8dB Horizontal 4 82 dB Radiated Disturbance Vertical 5 42 dB 8 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS ex 4 Results of individual test 4 1 Conducted disturbance Both conducted lines are measured in Quasi Peak and Average mode including the worst case data points for each tested configuration The EUT measured in accordance with the methods described in Clause 9 Limits for conducted disturbance at the mains ports of class A ITE Frequency range Limits Limits dB uV NOTE The lower limit shall apply at the transition frequency Limits for conducted disturbance at the mains ports of class B ITE The lower limit shall apply at the transition frequency NOTE 2 The limit decreases linearly with the logarithm of the frequency in the range 0 15 MHz to 0 50 MHz NOTE
45. mA 8 372mA 0 349mA 0 375mA 49 27mA 73 91mA 5 103mA 5 162mA 0 223mA 0 248mA 43 48mA 65 22mA 4 970mA 5 008mA 0 254mA 0 281mA 38 90mA 58 35mA 3 834mA 3 876mA 0 310mA 0 340mA 35 20mA 52 79mA 2 041mA 2 084mA 0 250mA 0 279mA 32 13mA 48 20mA 0 657mA 0 687mA 0 501mA 0 537mA 29 56mA 44 35mA 0 936mA 0 975mA 0 207mA 0 226mA 27 37mA 41 06mA 0 907mA 0 946mA 0 185mA 0 213mA 25 48mA 38 23mA 1 723mA 1 753mA 0 190mA 0 207mA 23 84mA 35 76mA 2 667mA 2 710mA 0 214mA 0 241mA 22 40mA 33 59mA 2 758mA 2 788mA 0 237mA 0 267mA 21 12mA 31 68mA 2472mA 2 506mA 0 216mA 0 238mA 19 97mA 29 96mA 1 820mA 1 852mA RRSSEEEESESERSSESESRSSE RKRKESSEEESESEERSSESRSRRSR RKRKESSEEESESEERSSESRSRSR 0 221mA 0 247mA 18 95mA 28 43mA 1 280mA 1 312mA 0 232mA 0 259mA lt L1 Reading is below limit 1 L2 Reading is below limit 2 N A Harmonic current below 0 696 of rated current or 5mA whichever is greater are disregarded 30 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS en Operating condition DVI Input Digital Test date 2008 08 04 Test engineer Hyun Jeong Jang Ambient temperature 24 2 C Relative humidity 40 Climate condition Atmospheric pressure 100 5 kPa Test place Shielded Room 3
46. n Atmospheric pressure 100 7 kPa vee Observation Performance Test Point Polarity Level Tr Th ns Note No Result kV Live 1 5 50ns 5kHz Note x 2L AF BL Neutral 1 5 50ns 5kHz Note 1 2L AXM BLJ PE Ground 1 5 50ns 5kHz Note 1X 2 AX BL a c power Live PE 1 5 50ns 5kHz Note 1 x 2 AM BU ports Neutral PE 1 5 50ns 5kHz Note 1X 2L AKN BL Live Neutral 1 5 50ns 5kHz Note 1E 2 AM BLU idi Ld E 1 5 50ns 5kHz NoteiX 2L AH BO LAN Ports 0 5 5 50ns 5kHz Note1 2L AL BL NOTE 1 There was no change compared with initial operation during the test 2 The transmission of data was stopped during the test but self recoverable after the test 54 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Lm 4 8 Surge The basic test procedure was in accordance with IEC 61000 4 5 Performance criteria Applied conditions Test specification doliis Combination wave ec power pelts Line to Line 1 kV Peak Line to earth 2 kV Peak signal and telecommunication ports ine to ground 1 kV Peak B d c power ports 0 5 kV Peak Waveform parameter Open circuit voltage 1 2 50 Tr Th us Short circuit current 8 20 Tr Th us Applicable only to ports which according to the manufacturer s specificati
47. ns PC Video In Analo Ping test of the EUT E 9 _ Ping Ll Stationary floor mounted equipment 2 the Type of the EUT DX Non stationary mounted EUT 3 the type of test facility Shielded Room 2 4 Test level 0 5kvV X 1kvV 5 Polarity of the test voltage DX Positive x Negative 6 Duration of the test 18 min Dx Live Dx Neutral x Live Neutral a c power ports X Live PE gt Neutral PE Live Neutral PE 7 EUT s ports to be tested X Live SES LI VO ports Others ports L Communication ports L d c power ports 4 7 2 Test instrumentation Test instrumentation used in the Electrical fast transient burst test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware Interval No Ver Date Month EFT Burst Generator NSG 2025 SCHAFFNER 19873 2007 09 06 12 CDN CDN 8015 SCHAFFNER 19073 N A N A 52 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory CERE Project No LBE081805 lt 4 LCD Monitor MG32PS 4 7 3 Photograph of the test Configuration 53 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS er 4 7 4 Test results Test date 2008 08 04 Hyun Jeong Jang Ambient temperature 25 0 C Relative humidity 48 Climate conditio
48. oltage shall occur at zero crossings of the voltage waveform The basic test procedure was in accordance with IEC 61000 4 11 Performance criteria Environmental Test Performance phenomenon specification criteria o 5 Voltage dips gt 95 Voltage interruptions NOTE Changes to occur at 0 degree crossover point of the voltage waveform 4 10 1 Test instrumentation 3 m reduction periods c See NOTE Test instrumentation used in the Voltage dips short interruptions and voltage variations test was as follows Test Serial or Calibration inetrumentation Model name Manufacturer Firmware Interval No Ver date Month PFS503 63A Voltage Dip PFS 508 EM TEST 10513100036 2007 06 16 12 Int ti iki X PLINE 1610 HAEFELY 083690 21 2008 05 13 12 62 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 4 10 2 Photograph of the test Configuration 63 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory LCD Monitor MG32PS Um Project No LBE081805 aT LCD Monitor MG32PS 4 10 3 Test results Operating condition PC Video In Analog _ Ping test Test date 2008 08 02 Test engineer Hyun Jeong Jang Ambient temperature 25 0 C Relative humidity 48 Climate condition Atmospheric
49. oltech Ver 3 13 08 N A N A 4 4 2 Photograph of the test Configuration Is Same the Harmonic current test photograph 37 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Lm 4 4 3 Test results Operating condition PC Video In Analog Ping test Test date 2008 08 04 Test engineer Hyun Jeong Jang Ambient temperature 24 2 Relative humidity 40 96 Climate condition Atmospheric pressure 100 5 kPa Test place Shielded Room 3 Product MONITOR 2008 Jul 29 10 47am Serial no None Description Result Name FLI ANALOG Voltech IEC61000 3 Windows Software 1 10 04RC5 Test Date 2008 Jul 29 9 33am Type of Test Flickermeter Test Table Power Analyzer Voltech PM6000 SN 100006700167 Firmware Version v1 20 06RC3 Channel s 1 SN 090015500508 25 Adjusted Date 22 JUL 2007 2 SN 090015500521 25 Adjusted Date 23 JUL 2007 3 SN 090015500543 25 Adjusted Date 5 AUG 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None Shunt s 1 SN 091024300502 4 Adjusted Date 14 JUL 2007 2 SN 091024300503 4 Adjusted Date 14 JUL 2007 3 SN 091024300504 4 Adjusted Date 14 JUL 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None AC Source Mains Manual Source Overall Result Notes Measurement
50. om SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Product MONITOR 2008 Aug 02 5 07pm Serial no None Page 1 of 1 Description Result Name HAR_PC Voltech IEC61000 3 Windows Software 1 10 04RC5 Test Date 2008 Aug 02 4 06pm Type of Test Fluctuating Harmonics Test Worst Case Table 2006 Power Analyzer Voltech PM6000 SN 100006700167 Firmware version v1 20 06RC3 Channel s 1 SN 090015500508 25 Adjusted Date 22 JUL 2007 2 SN 090015500521 25 Adjusted Date 23 JUL 2007 3 SN 090015500543 25 Adjusted Date 5 AUG 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None Shunt s 1 SN 091024300502 4 Adjusted Date 14 JUL 2007 2 SN 091024300503 4 Adjusted Date 14 JUL 2007 3 SN 091024300504 4 Adjusted Date 14 JUL 2007 4 SN None Adjusted Date None 5 SN None Adjusted Date None 6 SN None Adjusted Date None AC Source Mains Manual Source Overall Result Notes Voltage Crest Factor outside permitted limits PASS Class Class D Class Multiplier 1 Average Max Limit2 Average Max Reading Reading Reading Reading 1 139mA 1 217mA 652 8mA 979 2mA 52 60mA 52 75mA 0 482mA 0 520mA 364 8mA 547 2mA 27 75mA 27 80mA 0 462mA 0 512mA 192 0mA 288 0mA 25 82mA 25 91mA 0 276mA 0 427mA 96 00mA 144 OmA 18 49mA 18 58mA 0 425mA 0 454mA 67 19mA 100 7mA 13 02mA 13 06mA 0 299mA 0 327mA 56 86mA 85 29mA 8 336
51. on may connect directly to outdoor cables Where normal functioning cannot be achieved because of the impact of the CDN on the EUT no test shall be required When the manufacturer specifies protection measures and it is impractical to simulate these measures during the tests then the applied test levels shall be reduced to 0 5 kV and 1 kV Applicable only to ports which according to the manufacturer s specification may connect directly to outdoor cables 4 8 1 Test instrumentation Test instrumentation used in the Surge test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware Interval No Ver Date Month Surge Tester t HAEFELY 152602 2008 01 30 12 Surge Impulse Module PIM 100 HAEFELY 152288 2008 01 23 12 Coupling Decoupling PCD 120 HAEFELY 148918 2008 01 23 12 Network Coupling Decoupling URGE HAEFELY 152636 2008 01 23 12 Network 100M Impulse Module PIM 120 HAEFELY 150663 2008 01 30 12 55 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Lm 4 8 2 Test conditions Test condition in the Surge immunity test was as follows 1 Representative operating conditions eSI DX PC Video In Analog Ping test DX EUT power supply L unshielded asymmetrically operated interconnection lines 2 e of unshi
52. or 2 Frequency Average Corr Margin Limit MHz dB y V dB dB dB u V 13 358 500 56 9 9 5 7 1 64 0 13 420 500 56 9 9 5 7 1 64 0 13 480 500 56 3 9 5 7 7 64 0 16 229 500 57 3 9 6 6 7 64 0 23 067 500 55 3 9 6 8 7 64 0 23 129 500 59 3 9 6 4 7 64 0 28 686 500 56 1 9 7 7 9 64 0 29 236 500 56 1 9 7 7 9 64 0 20 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS 4 2 Radiated disturbance Of those disturbances above L 20dB where L is the limit level in logarithmic units record at least the disturbance levels and the frequencies of the six highest disturbances The following data lists the significant emission frequencies measured levels correction factors for antenna and cables orientation of table polarization and height of antenna the corrected reading the limit and the amount of margin All measurements were taken utilizing quasi peak detection unless stated otherwise Measurements were performed at an antenna to EUT distance of 10 meters and elevated between 1 and 4 meters Both vertical and horizontal antenna polarizations were measured Limits for radiated disturbance of ITE at a measuring distance of 10 m Frequency range Limits Quasi peak Limits dB dB pV m NOTE 1 The lower limit shall apply at the transition frequency NOTE2 Additional provisions may be required for cases where interference occurs 4 2 1
53. place 10m Semi Anechoic Chamber 2 Receiving antenna mode Horizontal Vertical Test distance 10 m RF Semi Anechoic Chamber Result Reading c f Antenna factor Cable loss Amp Gain Margin Limit Result Note SAMSUNG lt lt Radiated Emission gt gt 24 July 2008 10 03 R4 10m Chamber 2 analog dat Model Standard CISPR Pub 22 Class B 10m Serial Remark1 Operator Remark2 AC Power Remark3 Temp Humidity Remark4 dB uV m 60 10m CISPRB Limit analog Spectrum H PK Spectrum V PK Suspected Item H Suspected Item V Final Item H QP Final Item V QP Frequency Final Result Horizontal Polarization QP No Frequency Reading c f Result Limit MHz dB uV dB 1 m dB uV m dB uV m 1 159 597 35 3 19 16 0 A 2 250 012 43 8 2 27 9 3 500 033 37 1 3 28 1 4 633 370 37 4 30 3 Vertical Polarization 0P Reading Gf Result in Remark dB uV d8 1 m dB uV m 31 7 17 3 14 4 No Frequency MHz 1 104 688 E 2 169 001 38 4 19 1 19 3 3 500 019 34 9 28 7 26 2 4 829 566 23 3 3 6 19 7 23 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS er Operating condition DVI Input Digital Ping test Test date 2008 07 30 Test engineer Hyun Jeong Jang Ambient temperature 23
54. ss 0 108 0 000 1 808 Pass NA 0 105 0 000 1 485 Y Y NE um 9 101 0 000 1 685 Pass X 0 102 0 000 0 566 Pass WA 33 ate ooo osm Pass x 1 42 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS en 4 5 Electrostatic discharge Contact discharges to the conductive surfaces and coupling planes The EUT shall be exposed to at least 200 discharges 100 each at negative and positive polarity ata minimum of four test points One of the test points are subjected to at least 50 indirect discharges to the center of the front edge of the horizontal coupling plane The remaining three test points are each receive at least 50 direct contact discharges If no direct contact test points are available then at least 200 indirect discharges be applied in the indirect mode Test is performed at a maximum repetition rate of one discharge per second Air discharges at slots and apertures and insulating surfaces On those parts of the EUT where it is not possible to perform contact discharge testing the equipment should be investigated to identify user accessible points where breakdown may occur Such points are tested using the air discharge method This investigation should be restricted to those area normally handled by the user A minimum of 10 single air discharges shall be applied to the selected test
55. the manufacturer s specification supports communication on cable lengths greater than 3m 4 9 1 Test conditions Test condition in the Radiated radio frequency and electromagnetic field test was as follows 1 Representative operating conditions of EUT DX PC Video In Analog Ping test 2 Type of EUT unit DX Single L Multiple 3 Type of test facility used Shielded Room 2 4 Frequency range of application the test 0 15 80 MHz 5 Frequency sweep rate 1 5x 10 3 decades s 6 Dwell time and frequency steps Dwell time 3 s Step size 1 96 7 Applied test level 3V 59 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS en 4 9 2 Test instrumentation Test instrumentation used in the Conducted disturbances induced by radio frequency fields test was as follows Serial or Calibration Test instrumentation Model name Manufacturer Firmware Interval No Ver date Month RF Generator NSG2070 Schaffner 1118 2008 06 16 12 Attenuator INA2070 1 Schaffner 2118 2008 03 06 12 Test Software Win 2070 Schaffner V01 05 N A N A Coupling Decoupling GDN M016 Schaffner 21246 2008 04 21 12 Network 4 9 4 Photograph of the test Configuration 60 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805
56. tor MG32PS m Rear 2 47 65 This report must not be reproduced except in full without written permission from SEC EMC Laboratory Project No LBE081805 LCD Monitor MG32PS Lm 4 6 Radiated radio frequency electromagnetic field The test was performed with the EUT exposed to both vertically and horizontally polarized fields on each of the four sides The dwell time at each frequency shall be not less than the time necessary for the EUT to be able to respond The basic test procedure was in accordance with IEC 61000 4 3 Performance criteria Performance criteria Test range MHz Remarks Test specification 3 V m unmodulated r m s The test level specified is 80 1000 80 AM 1 kHz prior to modulation See The frequency range is scanned as specified However when specified in Annex A EN55024 an additional comprehensive functional test Shall be carried out at a limited number of frequencies The selected frequencies are 80 120 160 230 434 460 600 863 and 900 MHz 1 96 4 6 1 Test conditions Test condition in the Radiated radio frequency and electromagnetic field test was as follows 1 Representative operating conditions X PC Video In Analog Ping test of EUT x Table top L a combination of the two 2 Type of the EUT a height above the ground plane LI Floor standing C 0 1 m 0 8 m 3 Type of test facility 3m Fully anechoic chamber

EMC TEST REPORT

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