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1. Above 1GHz a The EUT and support equipment were placed on the non conductive turntable 0 8m above the ground at a chamber The EUT was set 3 meters away from the receiving antenna which was mounted on an antenna tower Horn antenna was used as receiving antenna b The frequency range above 1GHz was checked The RBW of the receiver was set at 1MHz Set the receiver in Peak detector Max Hold mode Record the maximum field strength of all the pre scan process in the full band when the antenna is 1m and varied in both horizontal and vertical and the turntable is rotated from 0 to 360 degrees c For each frequency whose maximum record was higher or close to limit measure its Average value rotate the turntable from O to 360 degrees to find the degree where EUT radiated the maximum emission then set the test frequency receiver to EMI Average Detector and record the maximum value 10 Page 11 of 23 Unilab Shanghai Co Ltd No UL45520150619CE001 3 4 TEST RESULT 30MHz 1GHz EN Test mode Full load and connect network cable Level dBuV m 55022 CLASSB 30 100 200 200 400 200 600 700 800 900 1000 Frequency MHz Site chamber Condition EN 55022 CLASS B 3m VULB9160 HORIZONTAL EUT Model Name Temp Humi sas Cf 54 X Power Rating 74 Mode Discharge operation Memo ReadAntenn e Cable Preamp Limit Over Freq Level Factor Loss Factor Level Line Limit Remark MHz dBuV d8 dBuV
2. Antenna SCHWARZBECK VULB 9160 3316 09 19 2016 Shielding Room No 2 ESD Test IEC 61000 4 2 Equipment Manufacturer Model Serial No Due Date ESD Simulator EM TEST AG Version 2 31 DM 1132 09 04 2015 3M Full anechoic Chamber RF electromagnetic field Immunity Test IEC 61000 4 3 Equipment Manufacturer Serial No Due Date The measuring equipment utilized to perform the tests documented in this report has been calibrated once a year or in accordance with the manufacturer s recommendations and has been calibrated by accredited calibration laboratories 2 4 TEST FACILITY The site and apparatus are constructed in conformance with the requirements of ANSI C63 4 CISPR 16 1 1 and other equivalent standards The laboratory is compliance with the requirements of the ISO IEC EN 17025 LU Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 7 of 23 2 5 Immunity Performance Criteria The manufacturer has the obligation to express the performance criteria in terms which relate to the performance of his specific product when used as intended The following performance criteria are applicable and shall only be evaluated when the functions referred to are implemented Examples of functions defined by the manufacturer to be evaluated during testing include but are not limited to the following essential operational modes and states tests of all peripheral access hard disks flop
3. 150 pF Discharge Mode Single Discharge Discharge Period one second between each discharge 4 2 TEST SETUP ESD Insulation Foil Generator A 4 3 TEST PROCEDURE The test applied a non conductive surface and a horizontal coupling plane on a wooden table 0 8 m high standing on the reference ground plane which is a 3 m x 4 m metallic sheet with 1 5 mm thickness This reference ground plane projected beyond the EUT by at least 0 5 m on all sides and the minimum distance between the EUT and all other conductive structure except the ground plane beneath the EUT was more than 1 0 m ESD shall be applied only to those points and surfaces of the EUT which are expected to be touched during usual operation including user access as specified in the user manual The discharges shall be applied in the following A Contact discharge Tests shall be performed at a maximum repetition rate of one discharge per second a Direct discharge The tip of the discharge electrode should touch the EUT before the discharge switch was operated The EUT shall be exposed to at least 200 discharges 100 each at negative and positive polarity at a minimum of four test points a minimum of 50 discharges at each point One of the test points shall be subjected to at least 50 indirect discharges contact to the center of the front edge of the horizontal coupling plane If no direct contact test points are available then at least 200 indirect discharges
4. 7 4V 1400mAh 06 19 2015 06 19 2015 06 26 2015 55022 2010 2011 55024 2010 PASS Prepared by Reviewed by Senior Engineer Forest Cao Approved by Supervisor Engineer Eva Wang Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 3 of 23 TABLE OF CONTENTS 1 4 1d EUT DESCRHPHON aca cece 4 12 TIESTIMODEDESCBIPTION 4 2 TECHNIACE SUMMARY 5 2 1 SUMMARY OF STANDARDS AND TEST RESULTS D 2 2 TEST 5 23 TEST EQUIPMENT LIST 6 24 TEST FACILI Y unio eee nen ne ene ee eee 6 25 Immunity Performance 7 2 6 TEST SETUP CONFIGURATION esee 8 3 HADIATED DISTURBANCE RE 9 9 32 LIMS een ee ee HH 9 33 TEST PROCEDURE sess 10 24 TEST HESULT 11 4 ELECTROSTATIC DISCHA
5. m dBuV m dB 1 161 92 3 23 13 77 1 70 0 89 18 78 49 88 21 30 Peak 2 294 81 5 01 13 11 2 49 0 99 20 52 47 09 26 48 Peak 3 447 10 3 16 16 33 2 88 0 00 22 37 47 98 24 63 Peak 4 598 66 2 95 18 89 3 33 0 99 25 17 47 00 21 83 Peak 5 765 26 3 29 21 39 3 71 0 88 28 39 47 00 18 61 Peak 6 pp 890 39 3 98 22 38 4 02 0 898 30 30 47 00 16 70 Peak Li Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 12 of 23 Site Condition FUT Lovel dBuV m EN 55022 CLASS B 700 300 400 500 600 700 800 900 1000 Frequency chamber Model Name Temp Humi Power Rating EN 55022 CLASS B 3m VULB9160 VERTICAL E 54 4 DC 74 Discharge operation Mode Memo Freq MHz 1 97 90 159 98 3 221 09 4 613 94 5 777 87 6 pp 899 12 ReadAntenne Cable Preamp Limit Over Level Factor Loss Factor Level Line Limit Remark dBuV dB m dB dB dBuV m dBuV m dB 5 67 10 97 1 26 0 09 18 09 40 09 22 00 Peak 3 28 13 88 1 63 0 09 18 84 40 00 21 16 Peak 5 89 19 76 2 11 0 09 18 75 40 00 21 24 Peak 3 H5 319 19 3 39 6 80 26 43 427 08 20 57 Peak 3 56 21 44 3 89 9 09 28 89 47 09 18 20 Peak 6 84 22 58 4 806 0 00 33 48 427 08 13 52 Peak 12 LU Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 13 of 23 4 ELECTROSTATIC DISCHARGE ESD 4 1 TEST SPECIFICATION Basic Standard EN 55024 amp IEC 61000 4 2 Test Port Enclosure port Discharge Impedance 330 ohm
6. shall be applied in the indirect mode use of the Vertical Coupling Plane b Indirect discharge b1 Horizontal Coupling Plane HCP More than 50 single discharges were applied at the front edge of each HCP opposite the center point of the EUT and 0 1 from vertically the front of the EUT Discharge to the HCP was made horizontal to the edge of the HCP Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 14 of 23 b2 Vertical Coupling Plane VCP More than 50 single discharges were applied to the center of one vertical edge of the coupling plane The coupling plane of dimensions 0 5 m x 0 5 m was placed parallel to and positioned at a distance of 0 m from the EUT Discharges were applied to the coupling plane with this plane in sufficient different positions that all sides of the EUT were completely illuminated B Air discharge at slots and apertures and insulating surfaces On those parts of the EUT where it is not possible to perform contact discharge testing the equipment should be investigated to identify user accessible points where breakdown may occur Such points are tested using the air discharge method The round discharge tip of the discharge electrode was approached as fast as possible to touch the EUT After each discharge the ESD simulator discharge electrode was removed from the EUT The simulator was then re trigged for a new single discharge and applies more than 10 times on each reselecte
7. 1 Page 19 of 23 RADIO FREQUENCY ELECTROMAGNETIC FIELD IMMUNITY TEST SETUP 1 9 Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 20 of 23 APPENDIX 2 PHOTOGRAPHS OF EUT LI s M vl anh View of EUT 2 gt t 20 Unilab Shanghai Co Ltd No UL45520150619CE001 4 E m 2 Page 21 of 23 21 Unilab Shanghai Co Ltd No UL45520150619CE001 nun View of EUT 5 Page 22 of 23 22 Unilab Shanghai Co Ltd No UL45520150619CE001 Page 23 of 23 End of the report
8. ARDS AND TEST RESULTS The EUT have been tested according to the applicable standards as referenced below Test Standard Conducted disturbance EN 55022 2010 AC 2011 Radiated disturbance EN 55022 2010 Harmonic current emission EN 61000 3 2 2006 1 2009 A2 2009 N A Voltage fluctuations amp flicker EN 61000 3 3 2008 N A IMMUNITY EN 55024 2010 Electrostatic discharge ESD IEC 61000 4 2 ELEM Radio frequency electromagnetic IEC 61000 4 3 field Immunit Electrical fast transients EFT IEC 61000 4 4 DNA Radio frequency continuous 61000 4 6 conducted Immunity quang magnetic fields 61000 4 8 mmunity Voltage dips and interruptions 61000 4 1 1 Note 1 P means pass F means failure N A means not applicable Surges IEC 61000 4 5 N A N A N A N A A 2 2 TEST UNCERTAINTY Where relevant the following test uncertainty levels have been estimated for tests performed on the EUT as specified in CISPR 16 4 2 This uncertainty represents an expanded uncertainty expressed at approximately the 95 confidence level using a coverage factor of k 2 Value dB o Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 6 of 23 2 3 TEST EQUIPMENT LIST EE E anechoic Chamber Radiated disturbance Test Model SerialNo DueDate ET x amp ETS LINDGREN FACT 3 CT 0000336 11 25 2015 Accessory Equipment Receiver Agilent N9038A MY51210142 11 11 2015 EN
9. LU Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 1 of 23 EMC TEST REPORT Product Name Lithium ion Polymer Battery Model Name HCP484555NFC 2S1P Prepared for Shenzhen Honcell Energy Co Ltd 612 Bldg A Weidonglong Industrial Zone Meilong 194 Longhua New District Shenzhen 518109 China TEL 0755 23731316 FAX 0755 23731319 Prepared by Unilab Shanghai Co Ltd Floor 1 No 1350 Lianxi Rd Pudong New District Shanghai China TEL 86 21 5027 5125 FAX 86 21 5027 5126 Report Number UL45520150619001 Date of Report 06 26 2015 Date of Test 06 19 2015 06 26 2015 Notes The test results only relate to these samples which have been tested Partly using this report will not be admitted unless been allowed by Unilab Unilab is only responsible for the complete report with the reported stamp of Unilab LU Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 2 of 23 Applicant Manufacturer Product Name Brand Name Model Name Technical Data Date of Receipt Date of Test Test Standard Test Result Shenzhen Honcell Energy Co Ltd 612 Bldg A Weidonglong Industrial Zone Meilong Ave 194 Longhua New District Shenzhen 518109 China Shenzhen Honcell Energy Co Ltd 612 Bldg A Weidonglong Industrial Zone Meilong Ave 194 Longhua New District Shenzhen 518109 China Lithium ion Polymer Battery HC HCP484555NFC 281P DC
10. RGE 13 41 TEST 13 2 TEST SETUP 13 4 3 TESI PROCEDURE DM UU 13 4 4 A RESULTS amp 14 5 RF ELECTROMAGNETIC FIELD IMMUNITY usse 16 51 lt 48 16 52 CESTSEIUDP uitiis UII 16 5 3 TEST PROCEDURE anne renee 16 5 4 RESULTS 8 17 APPENDIX 1 PHOTOGRAPHS OF TEST SETUP 18 APPENDIX 2 PHOTOGRAPHS OF 20 LU Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 4 of 23 1 GENERAL INFORMATION 1 1 EUT DESCRIPTION Product Name Lithium ion Polymer Battery Model Name HCP484555NFC 2S1P Technical Data 7 4V 1400mAh Double batteries 1 2 TEST MODE DESCRIPTION Unilab has verified the construction and function in typical operation All the test modes were carried out with the EUT in normal operation which was shown in this test report is the worst test mode Final Test Mode Final Test Mode Discharge Operation Discharge Operation o Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 5 of 23 2 TECHNIACL SUMMARY 2 1 SUMMARY OF STAND
11. d point This procedure was repeated until the air discharge completed 4 4 RESULTS amp PERFORMANCE 14 Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 15 of 23 EUT Lithium ion Polymer Battery M N 484555 251 Humidity 51 Temperature 22 C Mode Discharge Operation Air discharge Direct discharge T Testlevel Minimum number of discharge 1933 est location Pursuant to per polarity each location EN55024 Criterion A Contact discharge HCP ET Result Test Test level Minimum number of discharge per Pursuant to location kV polarity each location 55024 Criterion A Contact discharge VCP Test Minimum number of discharge per at to location kV polarity each location EN55024 Criterion A Rear PASS Note 1 These points are evaluated before the test They could be discharged in the process of actual test LS LU Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 16 of 23 5 RF ELECTROMAGNETIC FIELD IMMUNITY 5 1 TEST SPECIFICATION Basic Standard EN 61000 4 3 Test Port Enclosure port Step Size 196 Modulation 1kHz 80 Dwell Time 1 second Polarization Horizontal amp Vertical 5 2 TEST SETUP am Full Anechoic Chamber Support Equipment Antenna Signal Generator Amplifier Control 8 onion ce System 11 A 5 3 TEST PROCEDURE a The EUT and support
12. equipment were placed on the non conductive table 0 8m above the ground plane at a fully anechoic chamber The transmit antenna was located at a distance of 3 meters from the EUT and support equipment b The frequency range is swept from 80MHz to 1000MHz with the signal 80 amplitude modulated with a 1 kHz sine wave The rate of sweep did not exceed 1 5x 10 decade s Where the frequency range is swept incrementally the step size was 1 The dwell time at each frequency shall be not less than the time necessary for the EUT to be able to respond c The test was performed with the EUT exposed to both vertically and horizontally polarized fields on each side A CCD camera was put inside the chamber and through its display to monitor the operational situation of the EUT to judge the EUT performance criterion during test 16 Unilab Shanghai Co Ltd No UL45520150619CE001 5 4 RESULTS amp PERFORMANCE Unilab Page 17 of 23 EUT Lithium ion Polymer Battery M N HCP484555NFC 2S1P Humidity 53 Temperature 23 C Mode Discharge Operation CO CO 3 17 Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 18 of 23 APPENDIX 1 PHOTOGRAPHS OF TEST SETUP RADIATED DISTURBANCE TEST SETUP 30M 1G 7 i 1 LP SU ITT 7 4 F B Y E d 7 J 18 Unilab Shanghai Co Ltd No UL45520150619CE00
13. hen either of these may be derived from the product description and documentation and by what the user may reasonably expect from the EUT if used as intended During and after testing a temporary loss of function is allowed provided the function is self recoverable or can be restored by the operation of the controls or cycling of the power to the EUT by the user in accordance with the manufacturer s CRITERION C instructions Functions and or information stored in non volatile memory or protected by a battery backup shall not be lost Functions and or information stored in non volatile memory or protected by a battery backup shall not be lost o Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 8 of 23 2 6 TEST SETUP CONFIGURATION See test photographs attached in Appendix 1 for the actual connections between EUT and support equipment Notes 1 All the equipment cables were placed in the worst case configuration to maximize the emission during the test 2 Grounding was established in accordance with the manufacturer s requirements and conditions for the intended use oO Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 9 of 23 3 RADIATED DISTURBANCE RE 3 1 TEST SETUP 30MHz 1GHz Antenna Support f Equipment Att Feed Point l per 1 4m I INI spectrum Analyzer Receiver Above 1GHz Supp
14. ort Equipment Antenna 3 a Att Feed Point Spectrum Analyzer Receiver 3 2 LIMITS EN Limits for radiated disturbance of Class B ITE Quasi peak limits at 3m Frequency MHz uV m limit above 1G at 3m Frequency GHz dB pV m ENT EMEN RN NOTE The lower limit shall apply at the transition frequencies LU Unilab Shanghai Co Ltd Unilab Report No UL45520150619CE001 Page 10 of 23 3 3 TEST PROCEDURE 30MHz 1GHz a The EUT and support equipment were placed on the non conductive turntable 0 8m above the horizontal metal ground plane at a chamber The EUT was set 3 meters away from the receiving antenna which was mounted on an antenna tower Broadband antenna Calibrated Bilog Antenna was used as receiving antenna b The frequency range from 30MHz to 1GHz was checked The RBW of the receiver was set at 120kHz Set the receiver in Peak detector Max Hold mode Record the maximum field strength of all the pre scan process in the full band when the antenna is varied between 1 4 m in both horizontal and vertical and the turntable is rotated from 0 to 360 degrees c For each frequency whose maximum record was higher or close to limit measure its QP value vary the antenna s height and rotate the turntable from 0 to 360 degrees to find the height and degree where EUT radiated the maximum emission then set the test frequency receiver to QP Detector and record the maximum value
15. py disks printers keyboard mouse etc quality of software execution quality of data display and transmission quality of speech transmission General Performance Criteria Product Standard EN 55024 2010 During and after the test the EUT shall continue to operate as intended without operator intervention No degradation of performance or loss of function is allowed below a minimum performance level specified by the manufacturer when the EUT is used as intended The performance level may CRITERION A be replaced by a permissible loss of performance If the minimum performance level or the permissible performance loss is not specified by the manufacturer then either of these may be derived from the product description and documentation and by what the user may reasonably expect from the EUT if used as intended After the test the EUT shall continue to operate as intended without operator intervention No degradation of performance or loss of function is allowed after the application of the phenomena below a performance level specified by the manufacturer when the EUT is used as intended The performance level may be replaced by a permissible loss of performance CRITERION B During the test degradation of performance is allowed However no change of operating state or stored data is allowed to persist after the test If the minimum performance level or the permissible performance loss is not specified by the manufacturer t

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