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KALOS 2 USER MANUAL

1. MAT S A 520 PN 071 0359 02 October 2005 Bitmap Bitmap The Bitmap tool has multiple operational modes available on Kalos 2 tester systems These operations include online data gathered using Kalos 2 Memory Tester and offline bfm files saved during online offline operations interactions The Bitmap viewer displays current online cell address failures of the device under test This includes two screen displays Bitmap and MegaMap The MegaMap is a compressed view of the total DUT s bit array whereas the Bitmap is a selected encompassed block of the MegaMap Maximum size of the MegaMap is 256 x 256 compression 288 M bit SRAM 1 SRAM 576 x M bits 2 SRAMs tied together with the Bitmap having a maximum of a 1024 x 1024 1 Meg display of any place on the MegaMap Zoom dependent NOTE If Zoom scale is 1 1 the maximum cell representation is a 1M bits 16 16 the minimum cell representation is a 4 K bits The Bitmap tool is launched by clicking on the Bitmap icon see Figure 299 or it can be selected launched from the Tools menu item Figure 299 Bitmap Icon Click here to open the Bitmap tool Options Utilities Tools Help 12 Sexe LY ga 5 0 PH Elal I O Property Pages The Bitmap tool property pages allow users to select which viewing operation to display There are four selections available Bitmap Definitions Display Socket amp Setups Searc
2. oooo o o o o 517 Figure 297 Value Log Property Pages oooooooooommo 519 Figure 298 Value Log Socket Table and Setups 520 Figure 299 Bitmap OQ visor as ea Rn ee Sea ot bee ds 521 Figure 300 Bitmap Primary Window 1 Mbit Display 523 Figure 301 Bitmap Primary Window 256 Kbit Display 524 Kalos 2 User Manual xix Figure 302 Bitmap Toolbar iue Ka di e sica Re Cc ee Re ica 526 Figure 303 Bitmap Property Page Bitmap and Mega Options 527 Figure 304 Bitmap Editor 2 uacua d accio ie OR ae new ed ea weld 528 Figure 305 Bitmap Scan 2 0c es 529 Figure 306 Display Socket amp Setups Definitions Property Page 530 Figure 307 Online Socket File Property Page 531 Figure 308 Display Socket File Property Page 532 Figure 309 Scan Setups Property Page 533 Figure 310 Search Tables Fail User Property Page 535 Figure 311 Overview Property Page Block Diagram 537 Figure 312 bim Viewer ees 538 Figure 313 BitPower Icon leen 539 List of Tables Table 1 Multi Slice Configuration Data liliis 3 Table 2 Network Protocols llle 20 Table 3 Pin Types and Tester Resources 00000 cee eees 45 Table 4 Kedit File Menu Description a 60 Table 5 Resou
3. Action Fit Soft Keys FKA FK2 FK3 FK4 FKS FKG FK7 FKS FK9 FK10 FK11 FK12 FK13 FK14 FK15 FK16 Device Lot Operator DIB part Comment deviceHame Alpha numeric operatorHame comment Date Time Serial Ho Flou Tester ID DIB serial user message Disabled Bonitor Honitor Disabled Device IF Direct Test um 11 57 47 AM FrontPanel Messages Z Kalos 2 User Manual 119 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 78 Optional PK2 Sort History EC system Front Panel E q Anl xl File View Options Utilities Tools Help Jj ta eu i 50 234 je a v IStart Stop ion Fit Soft Keys mra mo rs ra re FKE FKT FK8 FKa FKIO FK11 Fk12 reas res res res _ Active Slices Bank A Active Slices Bank B Active Slices Bank C Active Slices Bank D DUE Sort Mio Hretory mf 11 59 16 AM PA Operator IF Property Page The Front Panel requires interaction on multiple pages Overview Dib Info Device IF and Yield Monitor The Operator IF property page shown in Figure 79 provides a one page program loading interface for Kalos 2 test systems This property page allows the u
4. FrontPanel Messages NUM 01 29 18 PM 5 Click on the Start button to execute the test program All tests in the flow are executed up to and including the Read CKBD all test At this point the Action field at the top section of Front Panel turns yellow and displays the name and test number 2000 of the Read CKBD all test On Measure Read CKBD all id 2000 174 PN 071 0359 02 October 2005 Breaktrap Settings 6 A display of the contents can be viewed from the CView utility window 7 Once BreakMeas is set on a test the user can launch Kalos 2 application tools such as Shmoo Test Debugger and ShowBitz 8 If the user clicks the Start button again the tester continues executing subsequent tests in the flow until it finds the next measurement and then will BreakMeas on that In this example the next measurement is the pattern write INCKBD The user may also set BreakMeas on any other measurement in the flow by selecting it from the BreakOnTest field and clicking on the Start button This measurement must follow the Read CKBD test otherwise the test program executes through the end of the flow If the user clicks on the Clear Breaktrap button while BreakMeas is set on a test the ENDTEST of the EVENTMAP is executed if one exists then the pattern generator is reset and the message mode set to NORMAL appears in the CView window Set Up and Execute BreakFail Breaktrap Setting The BreakFail Breaktrap Setting can
5. zu SHMOO PATTERN rdaa subroutine pat FILE rdaa To VLOG PATTERN poll d7 bof pat FILE poll Cut hh PATTERN PATTERN wrtSTRIPES mask pat FILE vrtSTHMM GOD Ww w w w w w Ww w mw Ww 4 4 PATTERN wrt00 i1loc pat PATTERN rdSTRIPES pat FILE wrt00 4 icc FILE rasTrR Paste unpre prote LL PRRRRRAARRRRAA EERE AA AERA RARER ARERR AEE E Open Document rdaa subroutine kpl chi MIS T y d in SEQUENCE 2 Go To Definition Of rdaa subroutine readt A linear series of operations that wi array Can contain names of resources actions and names array of C functions declared in a CMODULE statement array A Sequence is a resource itself it can be used in a test sequence or other sequences JU RCRCRURCRCRCRCRCR RC RCRCRCRCRCR CR RC ROCA OR B B RCRCRCR CR OR B B CR RON A B B B A A 8 KG K B B 8 A8 8 8 n E mi array wrtCk WrtCr SEQUENCE power up seq rdCKE SET VCCO MAIN rdCKE SET ALLPINS VIH WrtC SET OUTPUTS HIZ wrtCk SET SYNC VIH rack de xdCKE SEQUENCE power down seq vita SET VCCO MAIN SET ALLPINS VIL SET OUTPUTS HIZ SET SYNC VIH y ma Program 4 La x Ready I ils ff Find in Files Compiler Output Ln 745 Col 22 Not connected For Help press F1 The Cut Copy and Paste options are like other text editor options The Cut and Copy selections become active only when text is selecte
6. KITE Software View Area Graphical representation of wafer data and or summaries Status Area Tool messages test status time etc Normal operation both interactive and automatic uses the tester s hardware and its supplied software utilities Usually the user provides the test program flow which supplies the sorting and binning criteria the pass fail criteria and all the individual test setups Wafermap Tool El system Front Panel OD File View Options Utilities Tools Help Y tia e dl RII boo JAE Era AE Action mo me m ms me m ne me nme nmn no mes no mas ms FrontPanel Messages NUM 11 21 52 AM A The following describes basic functions of the Wafermap feature property pages Sort Results The Sort Result property page shown in Figure 92 displays results of the test program currently running or the last completed wafer There is no Interactive Mode available to the user Kalos 2 User Manual 139 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 92 Sort Property Page a System Front Panel File View Options Utilities Tools Help tal 2 LE Hs EE e Bl v cea 0 Action Fi Soft Keys FK1 FK7 FKB FK9 FK10 FK11 FK12 fater o oe 06 o 00 ee ES 00 00 o 06 00 00 o 06 o 00 oo 06 00 oo oo 00 00 eo FrontPanel Messages num 11 21 52 AM
7. Grid Overlays a grid of lines on the waveform panes The distance between lines is equal to the X and Y scale factors Off Turns off the graticules 2 Click OK Kalos 2 User Manual 223 5 KITE Utilities Stack Display Order To choose the stack display order Select the Display Stack Topdown checkbox in the Tool Options window to display the stack from the top down Deselect the checkbox to display the stack from the bottom up Synchronize Y Axes The Synchronize Y Axes option is controlled by an on off toggle switch When the Synchronize Y Axes checkbox in the Tool 5 Options window is selected all waveforms on the stack with Y units that match the Y units of the TOS are synchronized In other words when the TOS waveform is scaled and or scrolled all matching waveforms scale and scroll along with it This enables direct comparison of waveforms and is useful when combined with the superimpose feature described later in this section When off all Y axes parameters are maintained separately 1 Select or deselect the Synchronize Y Axes checkbox from Tools Options Display window See Figure 140 2 Click OK Synchronize on Scroll This on off toggle switch is off by default When the feature is turned on all patches synchronize simultaneously on a horizontal or a vertical scroll in any given patch NOTE To work on Y axis the Synchronize Y Axes feature must be turned on Background Gratic
8. True Software bin False Hardware bin 396 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine Returns number of Number of devices kdx get total bin cn devices in the wafer int bin Bin number t which were tested by ane all sites and putto bool isSoftBin true M Ng ss n m specified bin alse Hardware bin Number of devices Returns number of devices in the lot int site which were tested by specified site and put kdx get bin lot site cnt int bin m True Software bin bool isSoftBin true EE Hardware bin Returns number of devices in the lot int eee ee which were tested by cnt f True Software bin bool isSoftBin true False Hardware bin Number of Tests Information Test numbers used in the following functions are defined as Base test number number assigned to the test in the KTL Auto test number number assigned to the test by DE These numbers coincide if KTL is created by Assigning a Unique Test Number to Each Test and Bin Return Value Description of Function Name Description Return Value Parameters Parameters Number of tests Nambanereats LEN CA kdx getNumTests executed tordevics Kalos DUT site number E Ayo test number Gets base and auto Kalos DUT site int site test numbers for number specified site int baseTnum Destination buffer for NULL base test number Gels base and auio nt
9. 34 PN 071 0359 02 October 2005 Working with Files and Folders in Windows XP Deleting Folders and Files While in the Explorer application delete a folder or file by right mouse clicking on the folder or file you want to delete A pop up menu appears Left mouse click on Delete A pop up menu appears to verify the execution of this command Kalos 2 User Manual 35 2 User Operations This page intentionally left blank 36 PN 071 0359 02 October 2005 TEST PROGRAM DEFINITION This chapter provides a definition of the Kalos Test Language KTL and Kalos Pattern Language KPL and an overview of the procedures involved in developing a test program file for the Kalos 2 memory tester Instructions for using the Kedit utility a Kalos supplied text editor used to generate edit compile and debug test programs are also provided Topics include e Test Program Language C Source File CMODULE Test Program File Program File Layout Socket Table Pingroups DC Tests Parametric Functional Test Bin Table Flow Statement Program Files Kedit Program Loading Navigation and Edit Tools Debugging Using Kedit Debugging KPL Source Code in Kedit IMPORTANT Version Compatibility Recompile Test Programs Per the Kalos software release policy all test programs must be recompiled when upgrading to a major release In order to use the 1 11 version of software all test programs must be
10. Auto test number kdx getCurTestNum test numbers for int baseTnum Destination buffer for current site j base test number Kalos 2 User Manual 397 5 KITE Utilities Work Environment Information Description of Function Name Description metri valued Return Value Parameters Parameters kdx isWafer Returns flag of wafer bool True if wafer test a testing PANA True if currently kde inWafer Returns flag of wafer testing a wafer False testing if between wafers wo OSS Returns type of True Kalos 2 kdx isK2 tester Kalos 1 or False Kalos 1 Reese A E AS Returns type of rue Kalos96 kdx isK96 tester Kalos96 or False Kalos48 Kalos48 void tt ef A O f test True Production kdx isProduction E dbi False Engineering mode AA Returns flag of testing True Multisite kdx_isMultisite by multiple sites False Single site BUNUNANGUSIY a Returns value of True Use kdx useNTprofiling NT PROFILING key False Don t use De mU 1 Returns value of ahar Username for kdx_getProdProfile NT PROD NAME production mode keyinINifle od UU kdx get userName Returns current A EA E Output Destination Files Description of Function Name Description aos Return Value Parameters Parameters kdx get output file Returns full path of Output file path Output ile Xa E 398 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine kdx get destination Ret
11. KDX START WAFER tart of wafer void KDX START DEVICE Start of device testing L DUI test information dutTestlInfo dti refer to KDX DUT TEST Results of test data engine if h i void uData void Daia l Test result refer to KDX END DEVICE Decus te RESULT enum in testi d ktypes h 1 in wafer not in wafer KDX END WAFER End of wafer KDX END LOT End of lot TPEDatalogPrintf is KDX USER PRINTF called in the test program KDX END SHMOO Complete shmoo E execution is finished NOTE Not all of the function events are described in Table 29 For example kdx return kdx register callbacks void 382 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine if kdx add callback KDX START LOT Statt lot trig false return 0 if kdx add callback KDX START WAFER start wafer trig Tala return 0 return 1 Any user defined name can be used for the function instead of start_lot_trig Start_wafer_trig etc These functions must however include arguments and a return value for each type of event Exported Functions of DE EXE Some custom DLLs have the ability to call functions exported by the DE EXE As described above kdx_add_callback is an example of such a function These functions are declared in the data_engine_if h and are implemented in the DE EXE The result of this function call can be DLL specific or not
12. Mask Editor The Mask Editor property page shown in Figure 93 allows the user to define and edit the wafer mask by number of rows number of columns add die delete die skip die and test die The Get On Line Sort Mask option gets the current mask into editor mask The user can generate a wafer mask for the selected device type which can be used for all available modes of the Wafermap The generated mask is used to represent the product die the test die and the skip die placements The initial generation of the wafer mask is determined by the number of row x and columns y selected with the rectangle die corner points being in a circle wafer The editor allows you to add or subtract die and designate skip or test die 140 PN 071 0359 02 October 2005 KITE Software Figure 93 Mask Editor Property Page E System Front Panel File View Options Utilities Tools Help sor sor Action ra FK1 FK2 FK3 FK4 FK5 FKG FK7 FK amp FK3 FK10 FK11 FK12 FK13 FK14 FK15 FK16 U 5 O o ee 90 OO ee Ll eo ee a 4 ia ee jos OO OOo 90 E 900 E eo pu QO Qe Oo OO oo QOO 900 Oo eo FrontPanel Messages num 03 19 55 PM NOTE Included is a Get Sort Mask push button for transferring the current online mask into the editor mask Automatic Mode Production Automatic mode provides for data gathering and visual
13. ratios harm int Finds the signal to noise ratio SNR signal to distortion ratio SDR and signal to noise and distortion ratio SNDR The number of harmonics to include must be provided If this value is 1 all harmonics are included read awav string Read the indicated AWAV file and push it onto the top of the stack If an ADIF file is specified it is read read awg lt string gt Read the indicated AWG Arbitrary Waveform Generator file and push it onto the top of the stack read cap lt string gt Read the indicated CAP Capture Processor file and push it onto the top of the stack read cmd lt string gt Read and execute the indicated command file recall int Recall the waveform from indicated register and push it onto the stack rectang splice Convert the top two real rectangular waveforms on the stack into a single complex rectangular waveform remove cursor lt string gt Remove the named cursor reverse Reverse the top waveform on the stack last data point becomes first second to last becomes second etc rotate up down Rotate the waveform stack up or down by one waveform scope acquire Digitize the data on the current pins using the current setup values scope auto on off Enable or disable auto update mode scope pins s Set the pin pins or pin lists for wh
14. 4 000 V rc dor ad AMA apan a aa rrr taa A e a ad cas edere iv dd ce defe Dt ce aldea OS ur nrc PIC a 3 000 V Ws esegue exa RR EE Or PES ui L AA erase KA Na PPP a A a td A DDR OE nl I Uie e tape br Toe a ala 2 000 V oa ur PII A a E a gala tay eie a REI tay IRL ca Se a tee tbe as sends Ot Sr bh Besos Berns AEE AA Rcs RAS aise tee E Vu 1 000 V Wu pec e Eie mr US k3 p p p p p t 10 00ns 15 00nS 20 00nS 25 00nS 30 00nS 35 00nS Kalos 2 User Manual 481 7 Shmoo and Bitmap Tools 3 D Plots Figure 268 3 D Fail to Pass Program filename Ser 1 Lot 1 Date mon day year time Comment user statement Level tablename Time tablename Pattern sequencernam Options X Axis VariableName Start 10 00nS Index 0 500nS Steps 50 Stop 35 00ns Y Axis VariableName Start 5 000 V Index 0 125 V Steps 15 Stop 2 000 V Y Axis VariableName Start 1 500 V Index 0 100 V Steps 10 Stop 2 500 V Fail to Pass 3D Shmoo Plot All Fail 1 1 600 V 2 1 700 V 3 1 800 V 4 1 900 V 5 2 000 V All Pass 6 2 100 V 7 2 200 V 8 2 300 V 9 2 400 V 0 2 500 V 5 000 V 22222211111 X X XkXkXkXkkk kk kk kk KKK KKK KK KK KKK ZP2AQQLILLLILILE KR KKK KKK KKK KKK KKK KK KKK KKK KKK KKK KK 333222211 F X XkkkXkkKkk kk KK KKK KK
15. Failed Shmoo Application Messages Brealtrap NUM 10 06 14 AM Kalos 2 User Manual 459 7 Shmoo and Bitmap Tools XY Origin The XY Origin condition allows the user to set the starting datapoint origin step zero of the selected variables of the current shmoo plot When a new XY origin is chosen the shmoo is redrawn using the new origin There are four possible settings The following describes each setting Top Left Corner Places the origin at the upper left corner of the shmoo display so that execution of the plot is from top to bottom and left to right This is the default condition of the shmoo environment Bottom Left Corner Resets the origin to the lower left corner of shmoo display so that execution of the plot is from bottom to top and left to right Top Right Corner Resets the origin to the upper right corner of the shmoo display so that execution of the plot is from top to bottom and right to left Bottom Right Corner Resets the origin to the lower right corner of shmoo display so that execution of the plot is from bottom to top and right to left NOTE The shmoo origin can be chosen from the top level shmoo by mouse clicking the desired corner Types The Types condition allows the user to choose the type of shmoo plot to be executed One Dimensional 1 D Two Dimensional 2 D or Three Dimensional 3 D 1 D Shmoo 1 D Shmoo setting causes the shmoo plot to be generated in one dimension along t
16. The Console Viewer is a viewer for observing communication messages sent from the i960 of each Kalos 2 board to the workstation computer This menu item activates the test debugger Test Debugger environment This utility allows the user to modify resources for the current test program on the fly without the need to re compile Kedit Kalos 2 KTL Editor is a Credence supplied text editor Analog Wavetool is a graphical tool used for manipulating waveforms A front end application intended for advanced debugging editing and running of test patterns as well as viewing the results of running stored patterns in History RAM Data Buffer Memory DBM Editor allows the user to select a fixed or customized format for the graphical table views Kalos 2 defined and or user defined Allows the user to launch the Datalog Engine which gives the user access to the data stream Note No Dialog window is displayed Visual confirmation is seen in the Front Panel Overview status or on the icon tray of the task bar Selection of the Cal Diag menu item activates the KITE Calibration and Diagnostics environment 112 PN 071 0359 02 October 2005 KITE Software Table 7 Front Panel Menu Bar Description Cont Option Function SHOW BITZ IDROM NVMDIB SYSTEM MONITOR MAP INIT Tools Selection of the ShowBitz menu item activates the ShowBitz environment This environment allows the user to
17. i Include socket table and bin table include socket 8 IO ktl PRRRRARRARAT ERR RA TRAE RE RARER RARE REAR RARE RRR AER ETE Uy C MODULES J SRATETTXARR EXTAT T G3 4 4 3 Y BIA GIO GAIA 4 4333 3n dann CMODULE pgRun c checkPgRun 0 JJ SSRETERRETXTETAYRXAXTETATRRTETARATTIETETARTIEAYTATIIYAY dde CYCLE_NAMES J RSEEREESRERZTETATASRETETATAYTETASAZTRAYERETTAYTRETTAY CYCLE NAMES noop JTTETSXT4 3T 44 Y 4T 3 433 333 93 9 3 9 9 93 9 3 3 a uen HS EDGESET J TTSTRXT4 3 43 3 939 3 9 9 9 9 9 9 9 9 9 9 033 3 9 9 034 9 9 9 00 0 00 0 0n vn EDGESET edgeSetsO noob f 214 PN 071 0359 02 October 2005 Lf RRRRRRRER ARANA REET REA REA RE RARE RAE ER REEREER AREA RENAE ER REE REE EERE RES Waveform AWT Waveform AWT The Analog Waveform AWT Editor also know as the Analog Wavetool is a graphical tool for manipulating waveforms This section includes Operation Waveform Filetypes User Interface The Analog Waveform AWT utility is launched by clicking on the Analog Waveform AWT Editor icon see Figure 138 or it can be selected launched from the Utilities Waveform AWT menu item Figure 138 Analog Waveform Icon Click here to open the Analog Waveform AWT Editor utility Utilities Tools Help en 9 a 50 Ha GE a8 Introduction The graphical Waveform tool is based on a stack system like a postfix reverse Polish notation pocket calculator
18. 387 5 KITE Utilities custom_test def kdx register callbacks start lot trig start wafer trig Create Custom Code Implement registered functions with code is required for created DLL DLL can collect data during testing and create files at certain events such as end lot or end wafer The data can be collected using parameters passed with registered functions which are called by DE EXE Data can be collected or DE EXE exported functions refer to Exported Functions of DE EXE can be called The Postprocessor must process all created files The kdx runBatchFile function is used for this purpose List of Exported Functions of DE EXE The following is a list of DE EXE exported functions which are declared in the data engine if h These functions are the main API functions to get information for DE DLL Data type definitions that are used in the functions follow e Standard C C data types DE specific types from data engine if h e Kalos 2 software specific types from deviceif h and ktypes h Pin assignment enums from nettypes exp h Functions marked with an have DLL specific call Common Functions Return Value Description of Function Name Description Econ viue Parameters Parameters Puts string to text Number of characters dump file refer to int written Collecting Log Files uU String format like for for Debugging a standard printf 388 PN 071 0359 02 October 2005 Datalog Engine and DL
19. Current Shmoo Plot Conditions Pass Skip 1 X Select TAA Start Value 155ns Index Value 1ns Steps Y Select vcc Start Value 1 Y Index Value 100mv Steps 15 00 0 Step 8 Now that the Setups and Selects are defined click on the Shmoo display property page Once the Test button is pressed the shmoo plot executes Any given point on the plot results in either a Pass Fail or Pass Skip and is represented by a matrix color on the grid display Pass points are shown in green and Fail points are shown in red Figure 276 shows the shmoo execution results of this example Kalos 2 User Manual 491 7 Shmoo and Bitmap Tools Figure 276 Shmoo Display 2 Shmoo Application File Edit Utilities Tools Help October 31 2003 03 09 PM Program nor demo DATE amp TIME START 155ns INDEX 1ns STEPS 70 STOP 225ns START 1 V INDEX 100mv STEPS 15 STOP 25 V 175ns 195ns 215ns TE EE ERES E EE LEE E E ER ES E E E ERES E EE E LES E ER ES E E ES ERES ES E E E d LE EE ES ER EE ERE E E ES E EE E E E E E ERES E EE ES ER EE ES EE E LE EL ES E E E E E ES E ES E ER ES ESSE EZ E ES ESSE E E EE ES ES E EZ EE E GEGEE E ER EIE E ES E ES EI ESI ES EG E EE E EI ELE ES E EE 175ns 215ns 5 From the shmoo plot note the access time tacc of the 16 M device at room temperature and at VCC 5 V is 50 ns 6 In order to save the Setup to a
20. NUM 09 34 53 AM DPS PMU The DPS power supplies Setups tab editor on the DPS PMU property page see Figure 242 allows for interaction between the Break Test or any selected DPSSET of the current loaded program The Apply Set buttons reload the modified DPSSET in the selected ETX slice The difference is the Apply operation also sends the resource table to the Kalos 2 hardware if it is displayed in yellow When selecting the Set operation unless the debug modes of looping are being executed the user must restart the device program to initiate changes NOTE The Apply Set buttons are active only if their backgrounds are highlighted yellow Kalos 2 User Manual 443 6 Test Debugger By selecting Break Test if the Break Test sequencer has a DPSSET or DPSSETS the user can select one for display and modification NOTE If the Break Test sequencer has no DPSSET present the selection must be the DPSSET Tables Figure 242 DPS PMU Property Page DPS Setups Tab Ed Test Debugger Application File Utilities Tools Help Overvie Socket osser oe avs Select bes ven PMU Setups Test Debugger Messages Breaktrap num ai5 25aM A The PMU Setups tab editor on the DPS PMU property page see Figure 243 allows for interaction between the Break Test or any selected PMU test of the currently loaded program The Apply Set buttons allows the modified PMU test to
21. NVM ID s The NVM ID s property page see Figure 246 displays selected fields from the optional Non Volatile Memory NVM on the Device Interface Board DIB of the Kalos 2 test system The INTERFACE ID table is not currently supported in KTL The following fields are read from the loadboard on the system and displayed in the LOAD BOARD field Serial Number up to 16 character string Part Number up to 16 character string User String 1 up to 16 character string User String 2 up to 16 character string Use the Read Refresh NVM button to read the loadboard data and display it in the LOAD BOARD fields of the NVMDIB ID property page If an NVM device with the PIB board part number serial number and path exists the contents can be read by selecting DBI Info from Front Panel then select Utilities gt NVMDIB to launch the dib NVM View window Program help is provided in the Device Interface Board NVM User s Guide This guide is accessed from the dib NVM View window From this window select Help gt User Guide 448 PN 071 0359 02 October 2005 Property Page Functions Figure 246 Misc NVM ID s Property Page DPS PMU NuM masa A Patterns Tab The Patterns property page shown in Figure 247 allows the user to view the patterns statements that are listed within the loaded test program and modify the FAIL MODE argument in the patterns statement The fail modes are Abort on fail Encount
22. Qa BH s En Foes Er Address E C KalosOS target config kalos v Go Folders Name Size Type Date Modified amp BIF PROM FILES E boot 1KB Text Document 3 11 2003 12 34 AM amp C3 dell E vxkernel 387KB SYM File 3 11 2003 12 34 AM Documents and Settings Ed vxkernel sm 2 462KB SM File 3 11 2003 12 34 AM emu Ed vxWorks kalos 1 342 KB KALOS File 3 11 2003 12 01 AM Kalos2 E C backup E C3 Caldiag caldiag960 C Debug amp C3 gnu 23 include Kalos OS Directory Ka Macros 7j Release Or targetmgr amp C3 Test amp Cj testcases CD My Music Ommi Data amp C3 ONYX PROM FILES C3 Program Files CD Sysprep XP amp temp C3 Tornado AE E C3 users amp C3 WINDOWS WUTemp GQ xilinx KI Windows XP Interface Controls The Windows XP graphical user interface contains standard controls and display areas which are part of the interface for any application which runs under Windows XP Their functions are explained in this section The Windows XP Graphical User Interface GUI provides the standard controls and displays of KITE This section is not intended to provide a full description of the Windows XP operating system but rather to explain the standard controls and interactions as they pertain to the KITE interface Each is discussed in the following subsections Start Menu The Start button used to quickly start a program or find a file is lo
23. Storing ASCII Strings in STDF File DE can determine if a test is a functional test or a parametric test According to that determination the DE automatically stores the information in the FTR or PTR fields It is sometime necessary to insert a certain string into the STDF file independent from the test name and test number For example this string may reflect information regarding a functional test In this case it is possible to use the STDF DTR Data test Record for this purpose The TPEDatalogPrintf function must be used to put an ASCII string into this DTR DTR is generated every time this TPEDatalogPrintf is used in the test program The LOG DTR switch in kalos production ini enables disables this feature NorE Not all STDF data analysis packages can read the DTR If that is the case refer to the following section Putting C Hook Computed Data Into the STDF File 378 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine Putting C Hook Computed Data Into the STDF File The ability to judge a result is calculated in the C Hook This result is categorize as pass or fail using the TPEJudgeResult function This function only accepts the Value LLim and ULim as arguments and does not facilitate putting the result in the STDF file However there are scenarios to log multiple results in the STDF from the same test with the same test name In this scenario the TPE function TPESetTestName const char name
24. Typically tests are run based on the order specified in a flow statement The EVENT MAP statement permits running specific tests based on the occurrence of an event There are seven events that the EVENT MAP statement looks for to trigger the running of a user specified test CONFIG The CONFIG statement provides two functions One is to allow the user to select which FLOW and initialization SEQUENCE to activate when loading a test program The second is to run specific tests based on the occurrence of an event This second feature is similar to the function of the EVENT MAP statement 56 PN 071 0359 02 October 2005 Online Help Documentation Online Help Documentation The Kalos 2 documentation set is a collection of Credence manuals and technical documents which have been prepared for online viewing using Adobe Acrobat Reader To view the documentation Adobe Acrobat Reader with Search must be installed on the computer The 32 bit version of Reader with Search for Windows is included on the Kalos 2 CD To install it locate the file named rs405eng exe and double click on its icon Installation instructions can also be found in the Readme txt file located on the Kalos 2 CD Follow the instructions provided by the Adobe installation wizard to complete the task To access Kalos 2 documentation insert the CD into the CD ROM drive of the computer If the KITE software installation contained on the CD was run previously the docum
25. Wc Arith Functions Wc Arith menu items and a description of each function are shown in Table 16 Table 16 WC Arith Function Descriptions Function Adds a constant to the TOS waveform Subtracts a constant from the TOS waveform Multiplies the TOS waveform by a constant Divides the TOS waveform by a constant Divides a constant by the TOS waveform This can be used to invert the waveform 1 0 Wf Clips the TOS waveform to a constant that is does not allow the magnitude of the waveform to go above the constant value Clips the TOS waveform to upper and lower constants that is does not allow the magnitude of the waveform to go above the upper constant or below the lower constant Shifts the numeric value of each point in the TOS waveform left or right by some number of bits with zero fill and replaces the TOS waveform with the result Performs a logical AND OR or XOR of the mask with the numeric value of each point in the TOS waveform and replaces the TOS waveform with the result Sets the X offset time for the TOS waveform Note that the X offset is in terms of waveform and sample interval user units Performing this operation may move the waveform out of the field of view Normalizes the TOS waveform to be between 0 and 1 Takes the absolute value of the TOS waveform That is it makes all negative values positive and leaves all positive and zero values u
26. 5 KITE Utilities Table 26 Commands recognized by AWT user command Interpreter Cont Command Meaning store int Store the waveform on the top of the stack into the indicated register sub Subtract the next to top of stack waveform from the top of stack waveform sub const double Subtract a constant from the top of stack waveform swap Swap the top waveform on the stack with the next waveform on the stack sync y on off Set the Y axes synchronize on or off tester connect string head 1 2 Connect to the specified tester and test head tester disconnect Disconnect from the currently connected tester tester read string mode read auto retrace cmd on off cmd name lt string gt Read a waveform from the tester A connection must already be established The first string is the full path to the desired waveform on the tester Mode specifies the update mode If cmd is set to on command file processing is enabled it is disabled otherwise If no command file is specified by this command command file processing is disabled regardless of the cmd value specified The command file name is optional tester update string mode read auto retrace cmd on off cmd name lt string gt Modify the parameters of a waveform connected to the tester The first string is t
27. 5 4 3 1 1 Editor DBMEdit Editor allows the user to perform basic table editing operations to modify columns and rows The following describes the six areas of focus on this property page see Figure 204 1 DBM header titles using the formats from the DBM Viewer selections Changing formats does not destroy the current DBM data it changes only the way the data is presented to the user 2 Column bit selection yellow highlight for vertical editing 3 Pattern list selector and text field pointer for selecting the segment and or start point of the segment for viewing 4 Specified address range for row editing Kalos 2 User Manual 343 5 KITE Utilities 5 Current selected address view and a DBM highlighted for row editing 6 Control area for editing operations Figure 204 DBM Editor Sia o mmy IL Socket File The Socket File provides the compare table for the internal checks when configuring viewing displays i e 16 wide Only the selected file is used for this purpose and only the Interactive selection allows for generation and or modification NOTE Online Socket File information can be transferred for display setups 344 PN 071 0359 02 October 2005 DBM Editor DBMEDIT Defaults The Socket File Defaults property page provides a socket definition to the initialized slice see Figure 205 Another view is available under Socket File Online This view is discussed lat
28. Click any other item to change its current color using the waveform displayed Color dialog Arrows The Focus color is the color of the rectangle framing the Arrows Failed focused signal to which the data shown in the currently Grid displayed Detailed Information dialog refer refer to the Base Line Detailed Information Dialog Text Background Focus Reset The dialog window in Figure 177 allows users to define the following settings Number of the samples to be obtained within the samples max 190 cycles of maximum duration Time scale factor increase or decrease this value Time Scale 1 100 to expand or shrink the waveform area horizontally Line height scale factor increase or decrease this Line Height 10 50 value to expand or shrink the waveform area vertically Figure 177 Settings Dialog LATool Settings Precision Samples max 100 fa Scale Time Scale 1 100 HN Line Height 10 50 Kalos 2 User Manual 313 5 KITE Utilities DSTool window DSTool window allows the user to perform accurate voltage measurement on any channel during any cycle and provides detailed view of the result Figure 178 DSTool Window Logic Debug Tool File Action Edit View Options Help aw sHow EC cp lag DS YCD sy mE Setup Channel NN VOH Start n Index 0 1 Stop 52 Steps 52 Default Zoom Wind Apply Detail
29. End points in a flow Flow Connection of tests and bins Events Such as start test and end of lot Resources Data used by various test operations e W O specifications and pingroups User code C Hooks Kalos 2 User Manual 41 3 Test Program Definition KTL Program File Layout The organization of statements in a KTL file is dictated by one simple rule Nothing can be used unless it has been previously defined For example the name of a test cannot be used in a flow statement before that test is defined in a test statement the sequence actions of the test The order in which the test is laid out in the test program is critical to the test makeup A recommended order of KTL statements is provided in Figure 26 Notice that the socket table which defines all of the device pins comes before the pingroups which use device pins in their definition Next come several resource definitions which use pin names to program the hardware These are followed by tests which use resources in their sequences The BINTABLE is defined next although it can occur anywhere before FLOW Then comes FLOW and EVENT MAP which use tests in their tables Following this standard order helps to avoid compile errors 42 PN 071 0359 02 October 2005 Test Program File Figure 26 File Organization Sometimes included and more than one is possible _ CMODULE name or include cmodule cmodule h SOCK
30. N DD1 DD2 EMASK1 EMASK2 0 O 1 1 If G2h G2H DC DC P DD1 DD2 EMASK1 EMASK2 0 1 0 1 G2H G2L DC DC L DD1 DD2 EMASK1 EMASK2 1 0 O 0 304 PN 071 0359 02 October 2005 Logic Debug Tool G22 G2Z EL EL H DD1 DD2 EMASK1 EMASK2 1 1 1 0 G2Z G X DD1 DD2 EMASK1 EMASK2 1 O O 1 I 922 G22 DO DC D G D n DDI DD2 EMASK1 EMASK2 1 O 1 0 G2Z p DD1 DD2 EMASK1 EMASK2 1 1 O 0 G22 G22 EH EL Fs Users can right click any editable cell in the LDTool window and select the desired value from the pop up list of the available values see Figure 172 Figure 172 Cell Selection The Channels dialog allows the user to select the channels to be displayed in the LDTool window Kalos 2 User Manual 305 5 KITE Utilities Figure 173 Channels Dialog Channels Select Channels LO jv Kal I lt l lt lt aad 4 a I lt lt NY xl I lI Ki mu a UN UM UM M UM UM UM UM lt lt I E e nnno A IS xI xI m ow m MM MIMIN I IM IN I m o m MM MM IM UM M IM I H O m G O O IE IM Ka XI xI V 11 Selected Channels 1 2 4 10 25 58 73 Enter channels pin names groups DBUS 1 2 Pn04 Example 0 1 3 10 30 20 Pn01 INPUT Sort by number Show VCD Show All Hide All The check marks in the Select Channels field in
31. Oxle000 REGMEM CENT OMNI NORM 990000020 Act 0x08000 Exp 0x08000 EA 0x1e000 ii Address Uniqueness Test for Memory REGMEM CENT OMNI NORM 990000030 Act OxOffff Exp Ox0ffff EA 0x1e400 Checkerboard Test for Memory REGMEM CENT OMNI NORM 990000040 Act OxDaaaa Exp 0x0aaaa EA Oxle3ff PG ANC ACML RAM ADDR Testing REGMEM starts at 16 29 Selection Button Individual test rrrrrrrir rom m Fie ions Datalog window Status Window To view datalog results pause the diagnostic test then click on the selection button to the left of the individual test name in the center window The test results appear at the top of the datalog window The pass fail P F checkbox displays a green check mark for passing tests or a red x for failing tests 190 PN 071 0359 02 October 2005 Running System Diagnostics Diagnostic Settings The ability to set and control test parameters datalogging and hardware selection is accomplished through the Options Dialog settings window This diagnostic setting option is invoked by selecting the Options menu item or the Options icon on the toolbar in the Calibration Diagnostic window shown in Figure 118 The Options Dialog window shown in Figure 122 has three pages As illustrated the first page is used to establish test parameters and data logging The test flow is controlled by way of the Break Condition selections which specify w
32. Print Generates a hard copy of the current datalog and sends it to the selected printer Datalog Slices Select datalog display All means every slice is enabled Selecting the Kalos 2 slice number displays only datalog results The Print button launches the dialog window for controlling properties printer selection and the number of copies The data sent is the data currently displayed in the Datalog Slices Bank ff The datalog slice s file manager is activated by clicking File which launches the Save As dialog window for opening a new file or save an open file The directory path name is included with this operation The lower text field if a file is opened displays the filename Two modes are available Save and Automatic Save mode allows the user to manually send the current datalog to the open file Adds to the file does not overwrite e AutoSave mode sends the data to the file at the end of the current test sequence Format selection is only active when the Datalog On button is highlighted in green Current formats are Trace mode which allows the user to view the executing flow with test headers only all modes are disabled and the All Fail check boxes are enabled and Para All other selections are derived from this format Refer to the Datalog Formatting Modes section above for a description of each available mode The Clear operation erases all datalog slice s information This deletes the current dat
33. TPEDatalogOn return PASS RESULT dlog off void TPEDatalogOff return PASS 376 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine This C Hook consists of two functions dlog on enables STDF data generation and dlog off disables it This is accomplished using the TPE functions TPEDatalogOn and TPEDatalogOff This file must be defined as a CMODULE in the ktl test program CMODULE utils dlog on dlog off The example above automatically enables the datalog information at the start of the test program and it stays switched on during the entire test flow By switching the datalog on with the TPEDatalogOn function the datalog stream passes to the DE The system automatically makes a decision as to whether it is dealing with a parametric functional or user test The data ends up respectively in the PTR FTR or DTR record For a full description of each of the STDF records refer to the Standard Test Data Format STDF Specification manual After receiving the datalog stream DE can format the datalog information and put it into the STDF file format syntax This is done automatically Selective Datalog Files Generation For selective generation of datalog files it is necessary to disable datalog for tests that are not to be logged Leave datalog on for all other tests Relevant KTL code to accomplish this scenario follows TEST Cont io TESTNO 110 DESC This tests for cont
34. The difference between the Axis Printout Name Start value Index value Steps and the System Resource Variables Pin Pin Group Symbol Type Set Resource Start Index Stop is the Axis Printout is not system hardware related It simply defines the X and Y axis of the Shmoo display In this example the Axis Printout index and the System Variable index are both set to 2 ns The TAA neg index setup is shown in Figure 273 488 PN 071 0359 02 October 2005 Shmoo Plot Example Figure 273 tacc neg index Setup Y Shmoo Application File Edit Utilities Tools Help amp lEe Test amp stop cer Kx d EdgeSet No EDGESET Table r Axis Printout Name Start Index Stop Steps TAA 155ns 500ps 190ns 70 Low Limit Ih Limit 155ns 190ns EdgeSet Trk PiniPin Group Symbol Type EdgeSet Index Resource Start Index Stop read_b2_cy Step 6 Next select Edit gt New Setup from the menu bar in order to enter Vcc for the name of the second setup table Then select Edit gt Add DPS Element Under Pin Pingroup Symbol select VCC_1 and under Type select DPS Under Set 0 is now the only selection available since the DPS resource is independent of the tsets inside the KTL program Under Resource select VCCO_MAIN Under Start type 2 5 v Under Index type 100mv The Sto
35. The following results are written in the transcript pane Effective bits Kalos 2 User Manual 265 5 KITE Utilities Table 21 Wf Meas Function Descriptions Cont Menu Item INL DNL Ramp Function This operation measures the integral non linearity INL and differential non linearity DNL on a set of user collected data The data must be digitized from a linear ramp s This is allowed if the full scale range of the ADC is broken up into multiple segments but the order of segments must start from the most full scale ramp on TOS to the most zero scale The user is prompted for the following parameters when choosing this option Number of segments Number of ADC bits Number of ramps per segment averaging Ramp magnitude Vref of ADC ref to ref Starting offset of AWG ramp The following results are written in the transcript pane DNL minimum error DNL maximum error INL minimum error INL maximum error Offset error Gain error In addition the following waveforms are created and placed on the TOS DNL waveform INL waveform The original waveforms are simply pushed farther onto the stack but are otherwise unaltered 266 PN 071 0359 02 October 2005 Waveform AWT Table 21 Wf Meas Function Descriptions Cont Menu Item INL DNL Sine Function This operation measures the integral non linearity INL and differential non lin
36. These buttons change the X scale factor up or down by one step in a 1 2 5 sequence If the displayed scale factor is 2 0 pressing the up button changes the scale factor to 5 0 and pressing the down button changes the scale factor to 1 0 If the displayed scale factor is manually set to 2 5 pressing the up button still changes the scale factor to 5 0 but pressing the down button changes the scale factor by the nearest step in the 1 2 5 sequence and the result is 2 0 Y Scale There are four parts to the Y Scale field Scale Units Prefix Units Zoom Up Down Scale This field displays the relative scale of the Y graticule marks It can be changed to a preselected scale by using the drop down list or any desired scale can be entered in directly Units Prefix This field works in conjunction with the Units field To specify a fraction of the unit that follows enter a prefix such as nano milli etc To specify a time fraction 1 Click the drop down menu in the middle of the Y Scale field 2 Choose the Units Prefix n nano m milli etc Units This optional field to the right of the fractional measurement field displays the units in the Y direction To the right of this field is a string Div Zoom Up Down These buttons change the Y scale factor up or down by one step in a 1 2 5 10 sequence If the displayed scale factor is 2 0 pressing the up button changes the scale factor to 5 0 and pressing the dow
37. Workspace Enable disable presence of workspace Output Enable disable presence of output tools Bookmarks Macros Enable disable presence of macro tools Debug Enable disable presence of debug tools Debug Dialog Displays debug views for online debugging Datalog Dialog Compile Compile File Build Rebuild All Displays PG and TG datalog results captured under specified storage conditions after the pattern burst Recompiles only the current file Recompiles all files that were updated modified in the current project workspace Recompiles all files in the workspace Kalos 2 User Manual 69 3 Test Program Definition Table 6 Kedit Menu Bar Description Cont Option Stop Build Translate ktl from K1 to K2 timing Tools Find in Files Macros Start Recording Anonymous Macro Stop Recording Macro Play Anonymous Macro Once Play Anonymous Macro Many Save Anonymous Macro Function Stops the build of the current project workspace Translates Kalos 1 syntax CYCLE TABLE to Kalos 2 syntax EDGESET Search engine to find text in a set of files Manipulate saved macros Records each keystroke for playback until Stop Recording is clicked Stop the current macro Play the last recorded macro Play the last recorded macro N times Save the last recorded macro to a file Options Saving Select options for backups and auto save Resource Enable or disabl
38. ktl program currently loaded The entire program de compiled from binary to ASCII text is sent to the selected printer c About TBugger launches a dialog window and displays the current version information Figure 228 Toolbar Icons Ed Test Debugger Application iO x File View Utilities Tools Help S la OOO Kalos 2 User Manual 427 6 Test Debugger Property Page Functions This section provides detailed descriptions on the functionality of each property page of the Test Debugger utility Overview Window The Overview window Test Debugger default window as with all property pages contains a row of property page tabs see Figure 229 which open specified property pages Each property page contains information regarding values set for a particular function of the Kalos 2 hardware and the current test program Property pages display data in a text table format some of the pages include a graphical representation These views are designed for interfacing between the XP non real time and the ETX real time In addition to providing a viewer for this information each page allows modification of its data when the selected environment allows such changes The view area of the Overview property page displays the current contents of each resource table in a device program As shown in Figure 229 the Overview page displays an overview of the current loaded device program The selection of a property page is acco
39. sample rate double low freq double high freq double length int Creates a band pass filter waveform with the given parameters create band stop name lt string gt sample rate double low freq double high freq double length int Creates a band stop notch filter waveform with the given parameters create brickwall name lt string gt sample freq double start freq double stop freq double number samples int Creates a mathematically ideal filter with the given parameters create cWeight name lt string gt sample rate double length int Creates a C Message weighted filter for use in telecom applications create cursor lt string gt Creates a user cursor with the given name create dc name lt string gt rate double length int offset double Creates a DC waveform with the given parameters Kalos 2 User Manual 287 5 KITE Utilities Table 26 Commands recognized by AWT user command Interpreter Cont Command Meaning create gauss name string rate double length int seed int mean double std double Creates a Gaussian noise distribution with the given parameters If seed is not specified a random seed value is generated
40. 101 102 103 104 105 106 107 xo xi x2 x3 x4 x5 X6 x7 x8 x9 YO Yi Y2 Y3 Ya MW AMM PWNHRO Move Se No Ye No Yo No Test Program Language Not connected Sal The Kalos Pattern Language KPL enables the creation of test patterns in ASCII text format These patterns are then transformed by the Kalos Pattern Compiler KPC into binary images which are loaded into the pattern generator s prior to the execution of a test The compiled binary version of the KPL file includes a pbi pattern binary interface extension Labels h file s are also created by the pattern compiler to map labels to micro instruction locations The KPL is a block structured language that comprises elements shared with the test program Some elements are optional and some may appear more than once in a pattern file Kalos 2 User Manual 39 3 Test Program Definition C Source File CMODULE C functions can be used inside of a test sequence in a KTL program as long as they are first declared inside a CMODULE statement When used in a Kalos 2 test program C functions are referred to as C Hooks The C source file defines the C function s The compiled binary CMODULE s are given a o C Hook object file and a h C Hook header file extension See Figure 25 Figure 25 KTL Program wi Kedit Intel16M TJ File Edit View Compile Tools Options Window Help D mc C S 8 du gs 5 j gt
41. 3 While still depressing the mouse button drag the cursor to the right and select Folder A New Folder appears in the current directory Naming Folders and Files Name a New Folder or rename an existing folder by slowly double clicking the left mouse button on New Folder or on an existing folder name Type in the new name or change the existing name File names can be changed in the same manner Moving Folders and Files While in the Explorer application move a folder or file by left mouse clicking on the image to the left of the folder or file and while still depressing the left mouse button drag it to the new location If the folder or file is to be placed inside of an existing folder drag the folder file to that location the folder will highlight and release the mouse button Copying Folders and Files While in the Explorer application copy a folder by right mouse clicking on the folder you want to copy A pop up menu appears Left mouse click on Copy Open the directory in which the copied folder is to be placed Using the left mouse button go to Edit gt Paste in the pulldown menu and release Copy a file by right mouse clicking on the file you want to copy A pop up menu appears Left mouse click on Copy Open the directory in which the copied file is to be placed If the file is to be placed in an existing folder select the folder and using the left mouse button go to Edit gt Paste in the pulldown menu and release
42. 420 PN 071 0359 02 October 2005 Introduction Figure 225 Compile Option Settings Kedi class_program LA Zi PINOROUP ADDRESS AD A1 A2 A3 AG AS Al 2 413 414 A15 A16 A17 A10 PINOROUP ALLPINS 11 412 413 A14 A15 A16 A17 A18 0t NE 3 PINOROUP peus PINOROUP CONTROL i CE PINOROUP INPUTS 4 PINOROUP IMPUTSALL ADDRESS CONTROL PINOROUP OUTPUTS PINOROUP DBUSNINUS DQO DOL DOE DOS DOM DOS DOS Is lt gt Compl Ospa Fran Fin Compiler Options Global Options KI PG Behavior e K2 PG Behavior C Compiler Options KTL Compiler Options Click this area Pens ks to set the Release v Generate Header File No TBugger support compile option When this option is set and the user brings up the Front Panel and logs into the Engineering Property page the Test Bugger icon is grayed out resulting in no test debugger access Kalos 2 User Manual 421 6 Test Debugger Graphical User Interface The primary window property page display of the Test Debugger application is shown in Figure 226 This property page is subdivided into the following defined operational areas 1 Menu bar Interface for selecting the operations of the application 2 Toolbar icon Icon short cuts to the menu bar operations 3 Control area Select functional operations controls and a system monitor 4 View area Tabbed views for selecting specific over
43. Bresitrep MuM I01317AM Following is the description of each individual field of the Level Time Setups window 1 Break Test button switches between Break Test and Level Table or EdgeSet respectively When Break Test is selected Pin Monitor retrieves the KTL programmed Level Table and EdgeSet from the test program If Level Table or EdgeSet is selected manually select the Level Table or EdgeSet BreakTest Level EdgeSet when Break Test is selected these windows act as read only and display the Level Table or EdgeSet retrieved from the test program If Level Table or EdgeSet is selected a drop down menu appears The user must use this drop down menu to select the Level Table or EdgeSet used by the breaktrap 3 Table shows the current Level Table and EdgeSet EdgeSet select the EdgeSet on which the breaktrap is set 5 Address separates the tester channels by pin type The user must select a tab to view that pin type Kalos 2 User Manual 497 7 Shmoo and Bitmap Tools 6 Address Channel select a single pin of the selected pin type to modify the shmoo setups for that pin 7 Name Resource once a Level Table and EdgeSet are selected this area shows the resources defined for the selected pin 8 Programmed shows the value programmed in the test program for the respective resource 9 Start Value shows the Starting value the shmoo starts at determined by the index and number of steps with
44. Figure 134 Figure 135 Figure 136 Figure 137 Figure 138 Figure 139 Figure 140 Figure 141 Figure 142 Figure 143 Figure 144 Figure 145 Contents Apply Reset Save Get Settings 168 Brealdrap Settings vascos Ek RR AUR KAKALAS EO ena RAS 170 BreakMeas Select Read CKBD all Test 174 Pause Step ShowBitz PG BursSt o o o o o 179 Pause Step ShowBitz Eset View o o oooooooo 180 IDRom Icon eee 181 Idrom Window 0 eee 182 Save to IDROM Procedure a 183 CView Console Viewer ooooooooooooooommoos 184 Front Panel Toolbar 00 cee eee 187 Calibration and Diagnostic Programs 187 Calibration Diagnostics Programs 188 Test Suites eee 189 Test Suite Execution 000 eee eee 189 Diagnostic Windows sc x EREREG ERRARE RR RE RE HRD ERE 190 Options Dialog Settings Window 191 Options Dialog Page 2 ion hx RE Fern Rh WA 192 Summary ODIUOTIS 52x xcu Rex he Peace dice deena EROR KA 193 Matrix Chart ees 194 Slice and Channel Summaries a 195 TOOL CONS n onde see aaa 196 Front Panel Toolbar cece eee eee 198 Calibration Diagnostics Programs 198 MAP IPIT arc saad BAE MAAN a aod BAWA PARADA TAKA PLAN 199 Flow Selection llle 201 Front Panel Toolbar cece eee 208 CView Console Viewer
45. Figure 87 is a bar graph representation of the previous summary text table The draw area is divide into two sections Sort Soft or FBins summary selected from the BINS option and the bin counts category bar graph The Sort Summary consists of a color key for each sort number and its respective Pass Fail assignment The Pass Fail assignment is determined by the bin table of the current program The bar graph is an xy coordinate display of the die counts versus the selected bins categories Bins Bin flow defines hard bins 0 31 Soft Bin flow defines soft bins 0 255 FBins KTL program defines functional bins 0 1023 NOTE This is a Viewer only property page Interactive operations are not available 134 PN 071 0359 02 October 2005 KITE Software Figure 87 Summary Bar Chart EI System Front Panel File View Options Utilities Tools Help dg Ss Y 5 0 9915 A ES i v F Soft Keys FK1 FK2 FK3 FK4 FK5 FKG FK8 FK9 FK10 FK11 FK12 FK13 FK14 FK15 FK16 Text Sums Graphics m m m Summary Slices Bank A Summary Slices Bank B Summary Slices Bank C Summary Slices Bank D imm mM NNNM TITTITLTUITTTTT NBEBEBNBENEBEBENEENEEN O A A AMP E ooo oM anna E E oooooooan z F Sortbin Counts SEESESE SESS ESSE SESE ES A e EE E EP 4 5 Sort Categories FrontPanel Messages INUM 10 28 30 AM Summary
46. If the function is DLL specific DE EXE determines from which DLL the function is called and takes action specific to that DLL For example CString file name kdx get output file CString prog name kdx get program name kdx runBatchFile LPCTSTR fname The first function returns a name for a file to be created by DLL which is set in INI file The second function returns the name of the test program The third function processes a file after it is created by the postprocessor refer to Postprocessor The result of the first function call is different for each DLL because created file names are different for each DLL The result of the second function call is the same in all DLLs because the test program is the same for all DLLs The third function does not return anything but calls the postprocessor that was specified in the INI file using local overrides for that DLL Kalos 2 User Manual 383 5 KITE Utilities Figure 217 Structure of Custom DLL OnStartWafer OnStartDevice OnDutTest OnEndDevice OnEndWafer Kalos Datalog Data Engine EXE Custom DLL Custom DLL Generation The following steps are necessary to create DE custom DLL with Microsoft Visual C 6 VC Configure Kalos Configuration Manager for VC VC session for custom DLL development must be run from Kalos Configuration Manager only This is required to include all header and LIB files prope
47. KALOS HOME is the environmental variable representing the Kalos 2 setup home directory It is set in KALOS HOME box in the Kalos Configuration Manager Select Project Settings from the VC menu to open the Project Settings dialog Select All Configurations in the Settings For box e Select the C C tab in the Project Settings dialog then select Preprocessor in the Category box e Enter 5KALOS HOME include in the Additional include directories box Do not close the Project Settings dialog It is necessary for the next step Set Linking with LIB File Linking with Data Engine static library data engine lib or Dlog Engine static library dlog engine lib must be set in the project s settings This file is put into the KALOS_HOME lib directory at DE installation e Select the Link tab in the Project Settings dialog then select Input in the Category box Kalos 2 User Manual 385 5 KITE Utilities Enter data engine lib in the Object library modules box Enter KALOS_HOMEDMIb in the Additional library path box Do not close Project Settings dialog It is necessary for the next step Setup Output Directory An output directory for the project must be set in the directory were a custom DLL resides It is possible to specify any directory Usually other DLLs of DE reside in KALOS HOME TestMata engine Select the General tab in the Project Settings dialog Enter the path in the Output files box Press t
48. Kalos 2 project files must include a kpj extension The Load Program File operation is used to load an executable Kalos 2 test program onto the tester hardware It invokes a navigation window used for locating and selecting the desired test program file Kalos 2 executable programs must include a kbi extension Allows the user to run the currently selected flow The Exit operation exits Front Panel and closes any open data files or associated programs View lists the following view option for Front Panel Allows the user to see the pathname assignments selected for the program files Clicking on options invokes the following selections Expands the sort bin view to enable viewing of the bin numbers on a Kalos 2 tester Expands the sort bin view to enable viewing of the bin numbers on a PK2 tester Kalos 2 User Manual 111 4 Introduction to KITE Kalos 2 Integrated Test Environment Table 7 Front Panel Menu Bar Description Cont Option Function HistoryRam Datalog Formatting KDatalog Utilities CVIEWER TBUGGER Test Bugger KEDIT WAVEFORM AWT LDTOOL DBMEDIT DLOGEngine Datalog Engine CAL DIAG Allows users to monitor conditions of the pattern and timing generator at a set condition point within a functional test or a point within a patterns execution Selection of the Utilities option invokes the following list of available KITE application utilities
49. Maximum Waveform Display sss 225 Log Results in the Script Fill ccccncanas ede eGeiceeneeunwatadass s 226 Mark Results MT T T 226 Convert Spaces to Underscores lllllll leeren 227 Print in Black and While aaa a coe Seb eee ee a ee 227 Undo Level uas RR RR Rad aoe Pade eked ce Reade RA ban RRA 227 Pile DOCAOUS AAA OR 227 Creating a Waveform zz KK ARA NAG cern ended Oe heads Ca KORR Dew oaks 228 Waveform Parameter Details 002 ee 229 Opening a Waveform File 2222 2A ee 233 Working with Cursors nagsa haaa scat dot pa Rc e aab x RR d C de eee 233 SUSO BOXES Das ILC 233 Creating a Cursor ies RA AR RR 234 Modifying a Cursor Mp 235 Grabbing and Moving a Cursor slles leise 237 Moving a Cursor by Moving its Cursor Box aaa 238 Attaching a Cursor to a Waveform 0c c eee eee 238 Understanding the Delta Information 00 00 0 e eee eee 238 Name Pane o eregre tedadi aie sce pia a dw Os KG ee 239 b o cr A A AA AA 243 COW ca waaa bd KAGAD Wa KE E BUMAWI E adr buda s teeta de a a E 244 Superimpose On Off es 244 Clear Superimpose ees 244 Navigating the Waveform Graphic Pane a 244 ZOOMING esos rin Furio dom e eke SRO KLIK ceni KA KK BG KON AA 245 SCOUMNG rrr 245 Annotating Waveforms Markers 0000 e eee eee 247 o ru mms 247 Evi Temm PDT 247 Label M 248 Data cM 248 Marker Types amak cade
50. ONING zero ea dessus ds dU bano 465 Interactive rrr 466 Setups Property Page asse RS AA baw Kae KANA 468 Composites Property Page Accumulate Mode 2055 470 Online Operations 00000 eee 471 ASCII or Screen Print Operations 0 0000 cee ees 471 One Dimensional Shmoo Plot 2000 0c 472 Two Dimensional Shmoo Plot 00 00 c eee eens 473 Three Dimensional Shmoo Plot 0c eee ee 474 PMU and DPS Plots 2 0 00 c cee nes 476 Accumulate Mode 0 000 cece ee eee eens 476 ASCII Printout Examples 00 ccc ees 479 1 D and 2 D Plots na ta araa ccc es 479 a a ence a cata O asa eae 482 PMU XY Plots RR Rr 484 PPMU PI0l Sp nanaman paa tard added 484 Shmoo Plot Example eres 485 Implementation lt ereere ree 485 Pin Monitor llle es 493 Pin Monitor Window 2 22 rr 493 Power Setups Window 2 2 22 se 495 Level Time Setups Window 222 2 496 Levels Window ssesesl rrr 498 Times Window sssslle es 500 Socket Window 0 00 es 501 CIEL Pp TM 518 Bitmap sk OREGON ER KAG ORA eee wae CR RH a CALCE Nam Rn CR 521 Prop rty col MMC ITEM 521 Menu and Toolbar ees 524 Bitmap Property Page 2 721 a aa ma sr E RR EE 526 Definition Display Socket amp Setups Property Page 529 Kalos 2 User Manual xi DEDS aNG Na a nara aa ap Aba eae ba
51. PN 071 0359 02 October 2005 Test Program File Functional Test Functional testing verifies that the DUT correctly performs its intended logical functions These tests verify functionality of the device by applying pattern vectors which detect faults within the DUT These vectors apply all the necessary input signals and monitor the output signals to determine pass fail results Bin Table A Bin Table is a statement which contains information for sorting tested devices into appropriate groups known as bins based on pass or fail results Since the result of testing a device is to assign it to a bin a bin is also considered an end point in a flow There are 32 hardware and 1024 software bins available for each test program Hardware bins are used to physically separate devices using a mechanical handler or prober e Software bins facilitate the collection of summary information for tested devices by recording the number of times a test branches to each device In order to interpret the data this generates each software bin should be assigned a unique bin number Once a test branches to a bin the testing of the DUT is complete and the binning information is logged to the workstation computer see Figure 32 Kalos 2 User Manual 51 3 Test Program Definition Figure 32 Bin Table w Kedit ifh demo J File Edit view Compile Tools Options Window Help D mii S QD ES E OS e 0 ANA HIJO Bi xi E ifh demo
52. Shmoo Application Messages E NUM 11 16 25 AM A Following is the description of each individual field of the Pin Monitor window 1 Slices shows the slice number on which the breaktrap is set 2 Action shows the test on which the breaktrap is set 3 4 Pin Monitor Tab Selection opens the window for the selected tab Pin Type perform a test on a pin of that type by selecting one of these tabs The tester channels are organized by the pin types Test initiates testing of each resource for the selected pin after shmoo setups are created Stop stops a test in progress Clear All clears the results of a previous test Select Sequence switches between Selected and Auto Sequence When a test is initiated from Selected Sequence the test is only performed on the selected pin When a test is initiated from Auto Sequence the test is performed one at a time on each pin of the selected pin type 494 PN 071 0359 02 October 2005 Pin Monitor 9 Individual performs the test using one pin at a time 10 Grouped tests evaluate a resource by taking all pins into account That is all pins are tested at the same time and affect the outcome of a single result To view the results the pin that was selected when the test was initiated must remain selected Power Setups Window The Power Setups window helps in characterizing device performance based on DUT power levels Select the DPSSET used by the test on wh
53. The minimum setup consists of the Axis Printout METE variables These include parameter name start value index value stop value and number of datapoints steps to be executed from the start value See Figure 257 Every axis setup has two edit areas axis printout and system resource variables The difference being the axis printout is not system related therefore the values are not checked for boundary limits New Delete Rename or Clear operations for the selected setup are accomplished by way of the menu bar 5Edit selection or by way of the pop up menu activated by right mouse clicking in the table area Modification of the element row contents is performed by way of pulldown lists and or text edit boxes Both are activated by a single left mouse click in the respective table area NOTE As with all Kalos 2 applications any field that is white in color can be edited while grayed out fields or options are either read only or unavailable The METE and all tracking parameters have individual start index and stop values with a common steps value Although they all have entry points only the following equation is used for each parameter entry start value plus index value times step number equals the stop value The assumption is if the user wants to control the parameter range by inputting the stop value instead of the index value then the step number must be entered before any stop value entrees Changing the step number
54. The top of stack waveform must be a linear ramp or set of ramp segments inl dnl sine full scale double amp double threshold int Find Integral and Differential Non Linearity of the top of stack waveform based on the given parameters The top of stack waveform must be sine wave interleave name lt string gt interleave factor int Interleave takes a set of waveforms and combines them to produce a single waveform This is the inverse of the deinterleave function Interleave name is the waveform name of the resulting interleaved waveform Interleave factor is the number of waveforms on the stack to combine to produce the output waveform Note that all the waveforms to interleave must have the same number of samples intermod dist full scale int first freq double second freq double Find the intermodulation distortion of the top of stack waveform based on the parameters given linear convolve Performs a mathematical linear convolution of top two waveforms on the stack log base double Take the log of each data point in the top waveform on the stack 290 PN 071 0359 02 October 2005 Waveform AWT Table 26 Commands recognized by AWT user command Interpreter Cont Command Meaning log results on off Enable or disable logging of results in the log file When on any result
55. Wafermap feature is accessed by way of the Front Panel Summary property page 200 PN 071 0359 02 October 2005 Device Testing Procedure Figure 131 Flow Selection wrt scram rd unscram Rens flow ECR flow Proceed through the following setup steps to perform device testing 1 Verify that the required Kalos 2 Active Slices appear in the Overview tab 2 Load the test program by selecting the File menu item Load Program or by clicking on the Load Program icon OR load the project file by clicking the Load Project file icon Kalos 2 User Manual 201 4 Introduction to KITE Kalos 2 Integrated Test Environment 3 Select the test program file using the Open dialog box Navigate to the folder where the test program is located LX Open Look in ES T74hc240 E e saf version one File name kbi Files of type Katos Program Binary kbi y Cancel To load the project file select the appropriate KPJ project folder that appears in the Open dialog box 202 PN 071 0359 02 October 2005 Device Testing Procedure Open Lookin arm HG e ez sg complete default fast misc version one Filename Files of type Kalos Project Binary kpi y Cancel Select the Program Selection from the list then click on the OK button Program Selection Complete Default Assignment Fast 4 Select the test program flow by clicking
56. WrtRd ChkBd Bin 9 Bin1 1 1 PASS Y we Bi z e Bin 10 Bin2 2 2 FAIL T Bin3 3 FAIL STOP h Socket Table The Socket table contains information for mapping device pins to tester channels see Figure 28 It also defines the properties of each pin Each device pin must be declared in the Socket Table before it can be assigned resources 44 PN 071 0359 02 October 2005 Test Program File A device pin is designated by DPn where n is a number from 1 to 1024 768 256 non signal pins There are at most 768 tester channels on a Kalos 2 16 board configuration but there can be up to 256 non signal pins power ground and no connect Each pin is given a unique name which may be used to program resources or create pingroups Signal pins are given a type and default Pattern Generator PG assignment Each pin may be assigned 1 to 4 channels on a Kalos 2 board but all pins must have the same number of channels assigned This is necessary for support of parallel test within each Kalos 2 slice Pin Types Two pin types and assignments are accepted in the pin definitions in order to allow specification of the second half of extended cycles where characteristics may differ from the first half For example DRAM devices with multiplexed address pins KTL supports up to 36 I Os in the socket table that map to pattern generator resources The I O count is accumulated from input output and input output pin types Table 3 lists
57. You can open the application by double clicking on the application in Windows Explorer using the right mouse button or you can double click on a shortcuts icon using the left mouse button If you choose to launch a file using a shortcut icon the application in which the file was created is also launched For example if the chosen file is a FrameMaker file FrameMaker launches then the selected file opens Launching KITE The launching of KITE software is part of the start up procedure for the Kalos 2 test system The user must invoke the KITE software in order to launch the Front Panel application The default condition of the KITE application is the production environment from which Kalos test programs are loaded and executed From Front Panel all other applications tools and utilities can be launched The menu bar and toolbar provide the mechanism for executing these other applications Kalos 2 User Manual 33 2 User Operations Working with Files and Folders in Windows XP This section describes some of the basic methods used to create name move copy and delete files and folders using the Windows XP environment Creating Folders New folders are created in the current directory Before creating a new folder ensure that you are in the directory in which you want the folder to reside To create a new folder 1 Launch the Explorer application 2 Left mouse click on the File button and drag the cursor down to New
58. breakpoint icon on the Debug toolbar to set the breakpoint Click the Start Continue Test icon on the Debug toolbar to begin testing If the breakpoint is reached where the flow stopped appears in the Context field of the variable window Use the Step over or Step into icon on the Debug toolbar to navigate to the next test in the flow or to step into the test sequence of the current test When the Step into icon is clicked the next sequence action to be executed is marked with a yellow arrow under the Context field in the variables window Whether the Step into or Step over icon is clicked the current action is executed and the next action is displayed The Step Out icon in the Debug toolbar executes the remaining sequence actions of the current test and stops at the next test in the flow For C code use the Step over or Step into icon to execute to the next line of code The Step out icon stops at the next line of calling function or the next line in KTL code if the current function is a C Hook called from KTL When the test program ends by binning out the final results may be seen in the CView application Use the Clear All KTL Breakpoints or the Clear All C Breakpoints icon on the Debug toolbar to remove the breakpoints set in KTL or C code Use the Stop test icon on the Debug toolbar to immediately stop testing To make modifications to the test program first click the Online Offline icon to go offline Make program changes
59. data reduction 543 DataLog 144 View Slices 147 AutoSave 147 control area 144 File manager 146 formatting 145 Save 147 Datalog 145 control area 145 property page 144 Datalog Engine also see DE 354 datapoint shmoo 457 DBM 543 Hex format 347 pattern segments 346 socket file 344 DBM Data Buffer Memory editor 340 DBM Editor menu and options 340 DBM Editor DBMEdit 340 DBMEdit 112 DBMEdit editor 342 DC parametric plot 452 DC power 7 DC tests 50 DC tests parametric 49 DC waveforms 233 DE also see Data Engine and Dlog Engine 354 ASCII string storing 378 bin information functions 396 C Hook computed data 379 Configuration Manager for VC 384 configuration transferring 363 configuration with kalos production ini 365 conversion to string functions 389 custom code 388 custom DLL code example 404 Index DUT and site number 394 enabled disabled 361 engineering environment 364 EXE exported functions 388 external datalogging 373 file generation 376 Flows 361 functions 388 functions exporting 387 get functions 392 global settings 365 GUI 355 header files 385 in offline mode 360 installation 362 kalos production ini 365 kalos production ini parsing functions 402 log files 359 multiwafermap settings 370 number of tests functions 397 output directory 386 output destination functions 398 pin assignment functions 390 postprocessor 358 prob
60. default values are used instead of missing fields although this is not related to the custom DLL fields If custom DLLs were used in the previous installation they will not be removed by DE install Their configuration in the kalos production ini must be transferred as described above If these DLLs were removed due to complete system reinstall or other causes they must be installed in their usual way Changes Needed for Engineering Environment In the production environment Kalos startup bat batch file is used for DE startup DE install script automatically adds a shortcut to this file in the Windows startup folder In engineering environment Kalos startup for kconfig bat batch file and Kalos Configuration Manager must be used for startup in the engineering environment This batch file is put in C WinNT by the installation The following steps are required for this purpose Inthe C WinNT Profiles All Users Start Menu Programs Startup directory remove the Kalos Startup shortcut e In this directory add a shortcut to War from KALOS_HOME bin Inthe Kalos 2 Configuration Manager select the Option Customize menu and then select Add Application Use the browse window to go to C WinNT In the File name selection box type in bat and press Enter A file called Kalos_startup_for_kconfig bat appears e Select this file and press OK The new icon looks like a computer for the batch file appears on the Kalos 2 Confi
61. equals one complete wave Samples per Cycle Number of points per cycle used to create the waveform Sample Interval 1 Fs Time that is to elapse between samples Start Delay Length of time to wait before beginning the sample Rise Time Time required for the output of a circuit to change its output from a low voltage level 0 to a high voltage level 1 after the change starts Amplitude Magnitude of variation in a changing quantity from its zero value Offset Relative location from zero on the Y axis at which to begin the drawing of the waveform The pulse waveform parameters are described in Table 12 Kalos 2 User Manual 231 5 KITE Utilities Table 12 Table 13 Pulse Waveforms Parameter Name Name associated with the waveform wavelet Num Cycles M Number of complete waves to display One cycle equals one complete wave Samples per Cycle Number of points per cycle used to create the waveform Sample Interval 1 Fs Time that is to elapse between samples Start Delay Length of time to wait before beginning the sample Rise Time Time required for the output of a circuit to change its output from a low voltage level 0 to a high voltage level 1 after the change starts Pulse Width The width measured in time of the sample pulse Fall Time Time required for the output of a circuit to change its output from a high
62. er devices in lot void Number of EN eue in lot void int number of active sites Destination array for Kalos DUT site numbers of active sites Size of array must be MAX DLOG SITES int site 1 int sites Kalos 2 User Manual 395 5 KITE Utilities kdx get site Bin Information Function Name Description Return Value Parameters kdx get binName kdx get binNums kdx get bin site cnt Kalos DUT site number Module number module number and site number on Site number on module module Default Kalos DUT site number or 1 Description of Return Value Parameters Bm nama int binNum Bin number Gets hardware or software bin name char buf Destination buffer for bin name bool isSoftBin true Gets total number of bins and puts their numbers into array int bins True Software bin False Hardware bin Total number of bins Destination array for numbers of bins Size of array must be MAX DLOG BINS bool isSoftBin true Gets Pass Fail type of bin int bin True Software bin False Hardware bin Integer representation of RESULT enum values Bin number bool isSoftBin true Returns number of devices in the wafer which were tested by True Software bin False Hardware bin Kalos DUT site number specified site and put Bin number to specified bin bool isSoftBin true
63. fprintf fp Tested 8d Passed 8d 6 2f Failed 8d 6 2f n num tested num good float num good float num tested 100 00 num failed float num failed float num tested 100 00 Generate Categories summary strcpy strbuf nCategoriesnSort Name num sites kdx get site info site nums for site ndx 0 site ndx lt num sites site _ndx sprintf bufrl K 02d site nums site ndx sprintf bufr2 8s bufr1 if strlen strbuf strlen bufr2 gt PRINTSTR SIZE fprintf fp 96s strbuf strcpy strbuf STR2HDR j strcat strbuf bufr2 strcat strbuf Totals Percent n fprintf fp s strbuf Generate hard bin summary num hbins kdx get binNums hbin nums false false Not softBins for hbin ndx 0 hbin ndx lt num hbins hbin_ndx bin num hbin nums hbin ndx if hbin ent kdx get total bin cnt bin num false 0 pf kdx get bin pf bin num false false Not softBins if pf PASS pfc P else if pf FAIL pfc F else pfe U sprintf bufrl 02d c bin num pfc strcpy strbuf bufr1 sprintf bufr2 10s kdx get binName bin num bufrl false strncat strbuf bufr2 10 for site ndx 0 site ndx lt num sites site _ndx if 408 PN 071 0359 02 October 2005 j End report Datalog Engine and DLOG Engine Get hard bin count cnt kdx get bin site cnt site nums site ndx bi
64. gt a Ae la x o Le 2 7e 2 4 Y Dl xd Ta FLOW Bituap CKBD DEMO flow Bitmap AAAA DEMO flow Bitmap Bitfails DEMO flow 6 Bitnap Scanner DEMO flow 9 Shmoo Vlog DEMO flow Shnoo DEMO inflow All test DEMO flow Variables flow Eecroff testcase flow Read DBM FF DBM flow ECR flow Readffff flow BOF ecrOff flow BOF ecr noDUT flow Learn GD data flow Program using DBMfile flow Read using DBMfile flow O PMU vs PPMU speed flow Write lfail bof flow Write lfail flow Test xlinktoy flow Test PMU RANGE OFF flow O Test DPS PMU flow DBM Y LINK TO X ECR flow2 DEM Y LINK TO X ECROD flow2 DEM X LINK TO Y ECR flow2 DEM X LINK TO Y ECROD flow2 6 DBM Y LINK TO X ECR flow3 DBM X LINK TO Y ECR flow3 DEM Y LINK TO X flow im nmw v try TO Y flow 8 Fies Test Program for 28FO16SV 16 MBIT 1 MBIT X 16 2 MBIT X 8 FlashFileTM MEMORY 00000000 00000000 LLLLL 0000 Inteli6M ktl J TRASERSTEAEAAAAAESEAAAOORAAATAAX4A AA RARA ATAR AREA n eat en DEVICE TYPE DESCRIPTION INTEL 28F016SV 16Meg 1M X 16 2M X 8 FLASHFILE MEMORY E Xi Ready Compiler Output Find in Files For Help press F1 Kalos 2 Files Before Compilation ktl kpl C Ln 3330 Col 58 Not connected After Compilation kbi pbi Labels h 0 cmodule h NorE File extensions may change in future revisions of software 40 PN 071 0359 02 October
65. local override section Kdx summary default is usually logfiles summary DESTINATION DIR D Vogfilesidest Destination directory for data files Used with the postprocessor POSTPROCESSOR KDX_DLL_DIR def_move bat Location and filename for a postprocessor file that executes at the end of each file generation The default file is def_move bat which moves files created during data collection from OUTPUT_DIR to DESTINATION_DIR FILENAME machine_id _ lotname _ start_time b_ d_ Y_ H M S Global default for file naming convention used in non probe situations The basic difference between FILENAME and WAFER_FILENAME is the default WAFER_FILENAME always includes the wafer number WAFER_FILENAME explained below is used in probe situations WAFER_FILENAME 96machine id 6 96lotname 6 Yowafer num INTOO 6 9ostart time 6b 96d 96Y 96H 76M 6S Yo Global default for file naming convention used in probe situations with wafers Options for the filename are by default machine_id machine ID lotname as specified in the Front Panel Overview Lot entry Yowafer num INTOO wafer number integer format two characters e g 07 Yostart time b_ d_ Y_ H M S time that file is created The month day and year are 96b d and y respectively Hour minutes and seconds are 96H M and 96S respectively LOWERCASE FILENAME false Can be True False 1 0 Option to make the filename lowercase BINARY ENABLED
66. note the Sample designation at the end of the field Value This field displays the sample interval of a time domain waveform It is the bin weight of a frequency domain waveform It can be any value To change the interval 1 Delete the current content of the Interval field 2 Enter a new value then press the Enter key This does not actually change the waveform but rather changes the header information that is used by the DSP functions There are two other parts to this field Units Prefix Units Units Prefix This field works in conjunction with the Units field To specify a Prefix 1 Click the drop down menu in the middle of the Interval field 2 Choose the desired prefix n nano m milli etc This Prefix can also be selected by typing the appropriate letter when entering the interval value A space represents a plain unit Units This is an optional field that displays units for the distance between points in the X direction Seconds are represented by s and is the default entry here This value can be set to any string the string is used to determine what waveforms track the TOS waveform when the scale factor and position are changed To change the X units 1 Delete the current content of the Units portion third item of the Interval field 2 Enter a new value then press the Enter key Changing this value for the TOS waveform automatically updates the X Scale units box as well Kalos 2 User
67. spooler 550 SRAM 550 stack 279 stack display order 224 stack index 279 stack position 240 standard 3 D Shmoo plot 475 standard tools Kedit 66 start button 28 Kalos 2 User Manual 563 Index start menu 28 start window compare marker 251 starting KITE 33 110 Statistics parameters 263 status bar 31 stop window compare marker 251 Store All Mode 165 store modes debugging in Kedit 83 Store Only Fail SOF 164 Store Only Fails 84 Store This Vector 84 Store This Vector STV 164 Store This Vector and Store Fail Only 164 storing a waveform 280 strobe 551 style drawing 223 Summary main window 131 property page 126 134 summary bar chart 135 bar graph 134 charts 134 135 graphs 136 individual file example printout 143 Summary Application control area 129 tool functionality 128 view area 129 summary structures 128 superimpose clear 244 on off 244 Swap button 256 switch ASIC 551 synchronize on scroll 224 synchronize Y axes 224 system operation 21 SYSTEM MONITOR 113 System Monitor 417 table socket property page 429 target manager 101 target manager removing 103 TBugger 112 TBUGGER Test Debugger 212 420 terabit 551 Test break test 434 select test 434 Test Bugger 212 test debug breaktrap settings 153 test debugger 212 419 420 422 424 Cons Vars 424 DPS 424 flow 423 levels 424 NVM ID s 448 overview 423 PMU Sets 424 p
68. when the STV control storage mode is selected Following is an example of stvOn and stvOff fail processor operations write cyo stvOn data Uxff t40usl nooplus cyc link cga x lt y jump if loop 0 noop cyc stvOff cga x lt y jump wrt if loop 1 tset0 stvOn H0000000000000 tset0 stvOff 0H00000000000 The stvOff mode may be overridden for a single cycle with the syntax shown below write cyc stv tega x lt y data xff tset0 repeat 10 stv 000000000000 Store Only Fail SOF In this storage mode only tester cycles with a strobe failure are stored The History RAM can still be armed and triggered however only data from fail cycles will exist in the RAM at end of test This mode allows more fail data to be collected since passing cycles are not stored Store This Vector and Store Fail Only By default both of these storage modes are enabled for Kalos 2 This is a hybrid mode that stores fails only for vectors cycles with the STV bit set To facilitate its use by default all logic vectors and algorithmic pattern instructions have the STV bit set except conditional fail instructions Conditional fail instructions are those which jump increment or call a subroutine based on whether or not a fail occurs in the kpl In this mode it is likely that the user will arm and trigger on first fail since this is the objective of this default 164 PN 071 0359 02 October 2005 History RAM
69. which ensures the tester matches the DUT width of this program Valid DUT widths are 48 96 192 384 and 768 5 Load the CMODULEs or clibrary files C object modules with the extension o defined in the test program 6 Load the test program which is a file name with a kbi extension 7 Load pattern files defined in the test program Patterns are defined with the PATTERN resource keyword The FILE parameter defines the pattern file name Every pattern has a file name with pbi extension Patterns that contain LVM data also have a file name with an ebd extension The LVM data portion of the pattern is loaded into the DRAM on the target as well as SRAM which may be viewed in Front Panel from the DRAM SRAM Viewer If inadequate space exists to load a pattern unused files in the DRAM are removed one at a time 8 Load DBM files defined in the test program DBM files are defined with the LOADBM resource keyword The FILE parameter defines the DBM file name DBM files have an hex extension At load time the DBM file is converted to the Kalos binary format and loaded to the DRAM as well as SRAM on the target If inadequate space exists to load a pattern unused files in the DRAM are removed one at a time The status of loaded DBM files may be viewed in Front Panel from the DRAM SRAM Viewer 9 If a Kalos Project file was loaded file name with extension kpj and the associated config keyword defines a KTL CONFIG statement the specifie
70. 2005 Test Program File Test Program File The KTL test program file contains the overall procedure for testing a device It includes functions for setting up the tester stimulating the device and checking the responses of the device The contents of a KTL test program file look similar to the contents of a simplified C language file The KTL file may begin with a header that contains directives common to the functions that follow It may also contain directives at different points throughout the program The body of the program contains several test program operations or data objects Each is defined in a statement block that is specific to its function There are five types of directives which are supported in the KTL They are include Points to a KTL program file clibrary Allows you to load compiled C object files to be included with your test program and can also load C Hooks from a directory other than where the test program is loaded from define Labels that are replaced by user defined text when the program is loaded or a text string is replaced ifdef Conditionally compile the block of lines through terminating endif endif Terminates corresponding block of lines that began with ifdef pragma Invokes special features The test program is a collection of data and sometimes includes compiled user code Conceptually the data is organized into the following parts Test Containers For test operations Bins
71. 454 Shmoo Toolbar ss ce Pkw RE ERU a 456 Shmoo Display AA 457 Selects Property Page aaa 459 Pass Skip Example onnan 0000 cece eee eee 463 Socket File Property Page Default With Interactive Enabled 465 Socket File Property Page Online 466 Socket File Property Page Online gt Transfer gt Interactive 467 Setups Property Page sce RR canes RR ERR 468 Property Page Setup Example 470 Composites Property Page ooooooooooooo 471 1 D Normal Shmoo oos er ior ein ete dace ee 472 Normal 2 D Shmoo Plot i cress eves RR Ren 473 Standard 3 D Shmoo Plot sellis 475 xviii PN 071 0359 02 October 2005 Contents Figure 263 Accumulate Passed Percentage Plot 477 Figure 264 Accumulate Passed Threshold Plot Value 50 478 Figure 265 Basic 2 D Default Setup 0 0 00000 e eee 479 Figure 266 Pass Skip 2 D 1 PSkip lt XSteps 480 Figure 267 Boundary Shmoo PSkip gt XSteps 481 Figure 268 3 D Fall to Pass ue paa Ex E RACER n beeen eee 482 Figure 269 3 D Pass to Fail 4 4 rrr a OR RR RC GS 483 Figure 270 PMU XY Plot acicate edo geheR C ER e EP Ed 484 Figure 271 PPMU XY Plot Leakage lt lt lt lt oooooo 484 Figure 272 Read Cycle of read AAAA fast Period is Set to 200 ns 486 Figure 273 tana neg Index Setup isis pee eked eee eae REC
72. 489 Figure 274 VCC Setup xm cios AA ie EROR AA MAR ac KA xs 490 Figure 275 Selects Property Page cee eee eee eee 491 Figure 276 Shmoo Display Ka aa eh pork RR NAKAW KA Rc sacs 492 Figure 277 Pin Monitor Window aaa a eee 494 Figure 278 Power Setups Window llle 495 Figure 279 Level Time Setups Window llle a 497 Figure 280 Levels WINDOW 2k kaa rn ERR ranas RR RR pes 499 Figure 281 Times WINDOW a nG rune simae px mn RR a 500 Figure 282 Socket WINDOW Uu sii a ex eese des ee Rn eR RR RR RR 501 Figure 293 Select FIOW waaa hee ar 504 Figure 284 Set Breaklrap iu wawa ku aie KA MG KAB AKA e Cen WANG 505 Figure 285 Front Panel with Breaktrap Set 506 Figure 286 Manually Selecting Level Table 507 Figure 287 Using the Break Test Button aa 508 Figure 288 Manually Selecting the EdgeSet 509 Figure 289 Selecting an EdgeSet ooooooooooooomooo 510 Figure 290 lOs Subtab uns a acis NG KAG ea AAKALA ac weed ee 511 Figure 291 Adjust IndeX scs rer hao AA perde chari ode equ udis d 512 Figure 292 Auto Sequence Test aaa eee 513 Figure 293 Grouped Testing 5i Paa Baka KABAN RR Rr RA RR RS 514 Figure 294 Setting DPSSET Using the Break Test Button 515 Figure 295 Manually Selecting a DPSSET 516 Figure 296 Power Supply Shmoo ResultS
73. 8 Run 15 Logic Debug Tool Switches between online and offline modes e Allows selection of the active module figure below e Opens the Save dialog for saving data as a vbd file Opens the Arm and Trigger Conditions dialog for setting the arm and trigger conditions Shows all channels in the LDTool and WaveForm windows in the same order as defined in the pattern file Reads from SRAM the currently loaded patterns and shows the data in the LDTool WaveForm and LATool windows Loads the edited data back to SRAM In the LDTool window this button runs the pattern once sends the input data to the device under test and gets back the output data In the LATool window it repeats running cycles incrementing the time by the Sample Resolution value starting from zero to the longest period defined in the pattern In the DSTool window it repeats running cycles incrementing the VOH and TIME by the Index and within the range defined in the Setup group Kalos 2 User Manual 325 5 KITE Utilities 9 Stop 10 Undo 11 Redo 12 Find 13 Find And Replace 14 Find And Replace String 15 Find And Replace Column 16 Go To 17 Show VectorChar Info 18 Clear Current window Stops pattern running Reverses the last edition of any editable data Repeats the last reversed edition Opens the Find dialog allowing the user to find a specified value or vector character in the LDTool window Opens the
74. 96 pin Kalos 2 main boards Each of the Kalos 2 96 pin main boards can be broken down into two 48 pin slices slice O and slice 1 Each slice is a 100 MHz test rate 48 I O pins single board tester and can test up to eight DUTs see Figure 3 Kalos 2 User Manual 1 Kalos 2 Hardware Configuration Figure 3 Test Head Layout Eighteen Kalos 2 memory boards are located on each side of the Kalos 2 test head Up to eight DUTs per 48 channels can be tested Nine boards per backplane 48 pins with a ETX 48 pins with a ETX Each board is split into two sections of 48 channels 96 pin total Through Kalos 2 software the 36 slots of Kalos 2 can be grouped as follows One Kalos 2 main board for 96 pins Two Kalos 2 main boards for 192 pins The test head pin configuration breaks down further as shown in Figure 4 6 PN 071 0359 02 October 2005 Kalos 2 Test Head Figure 4 Pin Configuration Breakdown Not currently supported aaa slice 0 1 48 pins 3 768 pins Not currently supported 96 pins 182 pins 3 384 pins Not currently supported Backplane and Wiring The Kalos 2 backplane is shown in Figure 5 Power and Ethernet Connection The backplane board contains the DC power Internal Board Monitor IBM link and Ethernet connections from the server to the Kalos 2 96 pin main boards Also on the backplane board are two DC to DC power converter modules One is for the Kalo
75. CHO FVMI_PINS 350mV 12 5 V 99 999un 2 5mA 1 5mA 1 3mA PASS 0 200 001 CH46 FVMI PINS 350mV 12 5 V 99 999uA 2 5mA 1 5mA 1 3mA PASS Test 0 A00 001 FVMI FAST PINS Test Mods Site PHY Pin Grp Test Description Force Range Measure Range Max Min PassFail 0 200 001 CHO FVMI FAST PINS 350mV 12 5 V 99 999uA 2 5mA 1 5mA 1 3m PASS 0 200 001 CH46 FVMI FAST PINS 350mY 12 5 V 99 999un 2 5mA 1 5mA 1 3mA PASS Test 0 A00 001 FVMI GANG Test Mods Site PHY Pin Grp Test Description Force Range Measure Range Max Min PassFail 0 A00 001 PO P46 FVMI GANG 1 V 12 5 V 250uA 2 5mA Ama 500uA PASS Test 0 200 001 FIMY GANG Test Mods Site PHY Pin Grp Test Description Force Range Measure Range Max Min PassFail 0 A00 001 PO P46 FIMV GANG imA 2 5mA 250mJ 12 5 V 1 v 500mY PASS Kalos2 A00 DUT 0 Result PASS SortBin 1 SoftBin 1 Tester ID kneves dxp Date April 19 2003 12 49PM FrontPanel Messages num 12 49 14 PM The following describes all datalog control area options shown in Figure 95 Datalog formatting Datalog On Off Enable disabling of datalog Headers Enable Test Headers enable disable All Fail Selection mode All P F tests or Fail tests only Program Loading reset Datalogger Option Engineering mode only for user selection for disabling datalog resetting on next program load Modes Para Parametric analog tests Kalos 2 User Manual 145 4 Introduction to KI
76. Calculator 255 Name 239 Transcript 283 Waveform Graphic 244 parallel test 548 parameter 548 parameter details for waveforms 229 parameter file 548 parametric test 548 parent directory 21 PASM 548 Pass Skip Number 462 Pass Fail assignment summary 134 pass fail results 200 password 23 pattern 548 pattern data 55 source 55 pattern debugging 82 PATTERN statement 55 pattern vector 548 PBI 548 PC requirements 20 PE 548 PE ASIC 548 PG 549 PG_RUN pc pattern 436 PG_STOP 437 pie chart summary 134 135 pie charts summary 135 Kalos 2 User Manual 561 Index pin 549 pin configuration breakdown 7 pin configuration I O 5 pin layout 12 Pin Monitor 114 451 493 breaktrap 493 examples 503 Level Time Setups 496 Levels 498 Power Setups 495 socket file 501 Times 500 pin types 45 Pin Group view option 440 PINGROUP statement 47 pingroups 47 pinlist 549 PLD 549 PMon 114 PMU 549 PMU editor 444 PMU modules 17 PMU plots 476 PMU shmoo 476 PMU testing 54 pogo pin 549 points drawing style 223 points mode 223 polar waveforms 279 Pop button 256 power shutoff switch 10 print operations shmoo 471 printing in black and white 227 prober 200 production mode 115 152 program file layout 42 program flow selection 203 program loading 59 201 program loading in Kedit 213 programmable logic levels 549 project loading 201 property page Chn checker 4
77. Control Area Specific control and mode selection Draw Area Selected Bitmap View max of 1024 x1024 with zooming Draw Area MegaMap with compression 288 M bit SRAM 1 SRAM 576 M bits 2 SRAMs tied together P om s wp gt N Bitmap Editor Scan sub page for the respective controls 8 Application message line and status bars 522 PN 071 0359 02 October 2005 Bitmap Figure 300 Bitmap Primary Window 1 Mbit Display 10 xl Fle Edt Wew Uitjes Tools Help ica sa a al MA RUN List Falls Size Failure List Width pi e NG 16 19 4M Kalos 2 User Manual 523 7 Shmoo and Bitmap Tools Figure 301 Bitmap Primary Window 256 Kbit Display Bitmap Application ES nml x Fie Edt Yew Utities Tools Help sal Sika S w e wie Display Socket amp Sctups Foil Toble Overviews amp BIM Viewer PN oe cis Decimal fe Lr sed amne AEV 1024 x 64 524288 FACES 2274 FO EON C COS 398 VV KEEGY SANEA FOL ADDRESSES PHYSICAL Row Column 1 Oey part Row 334 SU RoS tint ES ipo Note Bitmap Display is 256K bits maximum Flora LA AG Aray with less than 1600 1200 Display Settings SF ROW Coa tien nn m KALOS2 Menu and Toolbar The following are descriptions of File menu and toolbar options File Menu The following describes the File menu pulldown options Get ECR Data via Mode Selected Get current ECR data fr
78. DEN ECR test DP21 a6 ADDR_PIN xo 18 66 Mal DER ceat DP22 as ADDR_PIN Ya 19 67 em DP23 a ADDR PIN Y3 20 68 ECR test DP24 a3 ADDR PIN Y2 21 69 cxbd0_test DP25 a ADDR_PIN Yi 22 70 ckbdl test DP26 Ai ADDR PIN YO 23 1 71 flag reg test DP27 BYTE INPUT PIN NA 24 72 flag reg fast xy test DP28 a0 ADDR PIN zo 25 73 flag_reg chook_test DP29 DOO IO PIN 100 26 74 chen test DP30 DQ IO PIN 101 27 1 75 DP31 Do IO PIN 102 28 76 neas cap test ep DP32 Dno IO PIN 103 29 77 scope test DP33 DOM IO PIN 104 30 78 roin test DP34 Dos IO PIN 105 31 79 Evn Odd Frey shnoo DP35 DO6 IO PIN 106 32 80 Boc EOC load ctrl test DP36 DO IO PIN 107 33 81 BOF AOF test DP37 os IO PIN 108 34 82 VIH test DP38 DO IO PIN 109 35 83 VIHH pat test DP39 DO10 IO PIN 1010 36 84 D ilii uic DP40 DO IO PIN 1011 37 85 i pir dan DP41 DOL IO PIN 1012 38 86 1K resistor SEQ FAST test DP42 pois IO PIN 1013 39 87 pan bunp DPS abi test DP43 DOI IO PIN 1014 40 88 puu bump PE abi test DP44 DO15 IO PIN 1015 41 89 puu bump DPS chook test DP45 RDBY_ INPUT_PIN NA a2 90 slow DPS rise tine test DP46 OE INPUT_PIN NA 43 91 fast DPS rise time test WE INPUT PIN NA 44 92 start test WB INPUT PIN NA 45 93 e is pum INPUT PIN NA 46 94 E p
79. Editor Fie Ltibes Tools Help inimum Ba e mm 020000020000FC 2020000040000FA 2200000000000FFFFOODOFFFFDOODFFFFOODOFFFFFO 10001000FFFFODO0FFFFODO0FFFFOOOOFFFFOOOOKGRA 100020000000FFFFO000FFFFOO00FFFFOOO00FFFFD amp 10003000FFFFODOOFFFFODOOFFFFOO000FFFFO000C8 100040000000 FFFFOO000FFFFOOOO FFFFOO00FFFFDO 10005000FFFFOD0O0FFFFODOOFFFFOOQOFFFFOOD0AR 100060000000FFFFO000FFFFOO00FFFFOOOO0FFFFSS8 10007000FFFF0000FFFFOOQ0FFFFOOOOFFFFO00088 100000000000 FFFFOOOOFFFFOOOOFFFFOO0OFFFF7O 10009000FFFFODO0FFFFODO0FFFFOOQOFFFFOODOGGR 1000A0000000FFFFOO00FFFFOO00FFFFOOO00FFFFS amp 8 1000B000FFFFODOOFFFFOOOOFFFFOOOOFFFFO00048 7 1000C0000000FFFF0000 FFFFOO00FFKYFOOOOFFFF38U 1000D000FFFFODO0FFFFODOOFFFFOOQOFFFFOODO2 amp 1000E0000000FFFFO000FFFFOOO00FFFFOOODFFFF18 LODOFOOOFFFFOOOOFFFFOOOOFFFFOOOOFFFFOO0003 z20010000D000FFFFDOOOFFFFDOOOFFFFDOOOFFFFF7 10011000FFFFODOOFFFFODOOFFFFOOOOFFFFOOOOK7 100120000000FFFFO000FFFFOO00FFFFOOO0D0FFFFD7 10013000FFFFODOOFFFFODOOFFFFOO000FFFFO000C7 2001 40000000F FFFOOOOFFFFOOOOFFFFOOOOFF FER 10015000FFFFODO0FFFFODOOFFFFOOQOFFFFOO00A7 100160000000FFFFO000FFFFOO00FFFFOOO00FFFFS7 10017000FFFF0000FFFFOOO0FFFFOOOOFFFFO00087 z200100000000FFFFOODOFFFFDOODFFFFDODOFFFF77 10019000FFFFODO0FFFFODOOFFFFOOQOFFFFOODOG7 1001A0000000FFFFOOOOFFFFOOOOFFFFOOOOFFFFS7 LOOLBOOOFFFFOOOOFFFFOOOOFFFFOOOOFFFFOO0047 1A001C0000000FFFFOODOFFFFOO0OFFFFOO00FFFF37 1001D000FFFFODOO0FFFFOOOOFFFFOO 7100200000000FF
80. FALSE Can be True False 1 0 If set to 1 TRUE a datalog binary dump file is created refer to Collecting Log Files for Debugging This setting can also be changed in the DE Settings box in the Binary Dump check box COMPRESS TYPE z1 Can be 0 no compression 1 ZIP Option to compress datalog binary file in real time during its creation If set to O an ordinary binary file is created If set to 1 binary file is created and compressed to ZIP format Due to large sizes of binary files hundreds of megabytes per lot and high 90 compression ratio this feature helps to save hard disk space or collect much more data 366 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine BINARY SPLIT LOTS FALSE Can be True False 1 0 Option to split datalog binary file per lots If set to 1 the current binary file is closed and a new one is opened after the end of each lot This avoids extra large binary files creation ADD BIN HEADERS True Can be True False 1 0 Option to add header data at the start of every lot file if split lot feature is enabled These headers include data which is received only once at test program or prober handler DLLs loading and runtime decode strings BINARY DIR d binFiles Directory of the binary files location when BINARY ENABLED TRUE DISK SPACE LIMIT 300 in Mb lt 0 don t check Hard disk free space limit in Mb for datalog binary file logging Logging
81. Figure 102 History Ram Control From Datalog Property Page E system Front Panel File View Options Utilities Tools Help Q ala 2 Y 40 bio au ise a v M 0x000000aaaa 0 0x00002327 N 0x0000000000 1 0x00000000 N 0x0 M 0x0000010000 N 0x0000010000 2 1 0x00000000 9 0x00002327 1 0x00000000 9 0x00002327 1 0x00000000 9 0x00002327 0008 REF 0x00000000 b Daaaa 0000 pa N 0x0000000000 0009 REF 0x00000000 M 0x000000aaaa bo N 0x0000000000 Datalog On Select Func then Detail 10 10 05 AM The History Ram Control window appears as shown in Figure 103 Kalos 2 User Manual 159 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 103 History Ram Control Window g Scien Front Panel Utilities Tools Help ER AFR II AKA O reo rai maz ras rea res reae BB MH TETTE Active Slices Bank D Test 2200 A01 001 Read AAAA ECR Test Mods Site PHY Test Description 2200 01 001 Read AAAA ECR a1 CntrA Ox Z Y X 0x00 0000 0000 CntrB 0x Z Y X 0x00 0000 0000 Cycle Counter 131074 PG Stop Condition URAM Stop DER FailCntB DP o DP14 esse o DP15 o DP16 TOO o DP17 o o DP18 65536 o DP19 o o DP20 65536 o DP22 o o DP23 65536 o DP24 o DP25 65536 o DP26 o o DP27 65536 o DP28 o o DP29 6553
82. Flow FLOW flow4 test name Opens Shorts InputLeakageHigh InputLeakageLow OutputLeakageHigh OutputLeakageLow IccStandbyHi VCCReadICC CMOS VCCReadICC_TTL Read dut_ID Erase_array Read all ff Write 5555 WORD Read 5555 WORD erase block0 readff block0 Write AAAA all Read AAAA all Write 5555 all Read 0000 all Erase arrayl Read all ffl Write CKBD all Read CKBD all Write INVCKBD all Read 0000 alll he Example 1 The following test flow is used in this Examples section pass branch Shorts InputLeakageHigh InputLeakageLow OutputLeakageHigh OutputLeakageLow IccStandbyHi VCCReadICC CMOS VCCReadICC TTL Read dut ID Erase array Read all ff Write 5555 WORD Read 5555 WORD erase block0 readff block0 Write AAAA all Read AAAA all Write 5555 all Read 0000 all Erase arrayl Read all ffl Write CKBD all Read CKBD all Write INVCKBD all Read 0000 alll Binl fail branch Bin2 Bin3 Bin4 Bind Bin6 Bin7 Bin8 Bin9 Bin10 Bin11 Bin12 Bin13 Bin14 Bin15 Binl6 Bin17 Bin18 Bin19 Bin18 Bin20 Bin21 Bin22 Bin23 Bin24 Bin25 Bin26 The following section of code illustrates an example of a parametric test The name of the test is IccStandbyHI TEST IccStandbyHi TESTNO 800 DESC This test is for VCC Standby Hi Current SEQUENCE 172 PN 071 0359 02 Oc
83. Items llle 68 Navigating in Kedit aac ceu eme iR oca Rex Rn Ses 72 View Existing FLOW Files aaa aaa 73 Debugging in Kedlt ccc maa socer was wees be aw KA Ra KASAL 74 Target Manager Tester Communication 77 Online Load Buttons llle 78 Flow Selection 0 00 00 cece eee 79 Breakpoint Settings ua xc RR ewe a ee emake 79 Step Control of Execution 0 a 80 Variables Selection cee eee eee 81 Start KPL Debugging 22 xe ach ur xaO REOR n hve 82 KPL Debugging Resources 20 000 eee 82 Arm And Trigger Conditions lt lt ooo ooooooo 85 Run PG Button ea saraat 000 ccc ees 86 Datalog Dialog Window 0 000 eee eee 87 Resource Selection 88 Source File Locati0N o o oooooooooooororooo oo 89 Counter Group Format 000 cece eee eee eee 90 Data Display in Mex Format 2222222 arras 90 Pin Options Menu 00000 eee 91 Timing Edge Window 455 RR er RR ER REA RR x d 92 Timing Edge Details a akap ah EIE Rr XR ee Pines 93 Timing Edge Definitions a 94 Kalos Configuration Manager a 98 Software Version Selecti0N o ooooooooooomooo 98 Start Target Manager 220 eee eee 99 Configuration Manager Options 205 100 Target Status Window isis ke kx nhe NG BAWA or REA 101 Target Status Image Descriptions 102 Kalos 2 User Manual xi
84. KITE software It includes a description of the functions of the Front Panel The Front Panel serves as a graphical front end to load and control execution of test programs An overview of each property page is provided and how each property page relates to KITE tools and utilities is explained Instructions are provided on how to prepare a device for test load a test program and test the device once test system preparations are completed Topics include Test Preparation Target Manager Loading the Test Program Front Panel Interface KITE Software Calibration and Diagnostics Device Testing Procedure Kalos 2 User Manual 95 4 Introduction to KITE Kalos 2 Integrated Test Environment Description of KITE KITE is a collection of software tools that aid the development of test programs for testing devices on a Kalos 2 memory test system These tools are supplied on CD ROM for installation and used in a Windows XP environment Although test programs are based on the ANSI C language their development using the tools of KITE should present no problems even to users with limited C programming experience All KITE functions are compatible with the ANSI C language environment and input files can be created with most text editors along with the tools provided The basic steps involved in creating a test program in KITE as well as the resources required at each step follow Each step is discussed in greater detai
85. Kalos Modules Kalos 2 User Manual 199 4 Introduction to KITE Kalos 2 Integrated Test Environment Device Testing Procedure This section provides a step by step example of a basic device test procedure The Load Program operation is used to load an executable test program onto the tester hardware It invokes a navigation window used for locating and selecting the desired test program file Once a test program is loaded the user may select any flow in the loaded test program for kbi files by clicking on the Flow field see Figure 131 For kpj files the flow cannot be changed except from engineering mode Clicking in the window displays a pulldown menu showing the defined flows from within the program If an automatic prober or handler is used the Libraries area contains a list of software drivers for peripheral wafer probers and device handlers refer to Device IF on page 123 From this list the user can install the proper driver for the equipment being used The Status area displays information regarding the status of the installed peripheral device Refer to Step 7 in the following setup steps The Wafermap feature is a viewer for displaying the pass fail results or sorted die categories of selected wafers plotted within a two dimensional coordinate system The Sort Results display the previous and current sort results This includes the pass fail condition its sort category and the Kalos 2 module it was tested on The
86. PE Device Symbol pulldown menu 440 PN 071 0359 02 October 2005 Property Page Functions NorE The Test Debugger utility shows the levels in the applicable test as well as the levels in the sequence attached to the test In other words it goes two levels deep when showing the levels settings for the tester hardware If there is another sequence nested within the original sequence the levels feature is unable to display those levels Figure 239 Levels Property Page Pin Group Ed Test Debugger Application Overvie pan By set 7 PE Device Symbol electio Timings EdgeSet displays the timing Format and Period data in a spreadsheet format The Chn Checker and Waveforms are view only pages The white fields in the Timings can be edited modified The Apply Set buttons allow the modified cycle table to re load in the selected ETX slice The difference is the Apply operation also sends the resource table to the Kalos 2 hardware When selecting the Set operation unless the debug modes of looping are being executed the user must restart the device program to initiate changes NOTE The Apply Set buttons are active only if their backgrounds are highlighted yellow Kalos 2 User Manual 441 6 Test Debugger The current Break Tests cycle table or the selected cycle table controls allow for the selection of a specific cycle table for viewing and or editing The user can tab through and select whic
87. Property Page 209 CView ICON 1 lee 210 Test Bugger ICON anaana uaaa eee 212 IRS CIE ICON mL 213 Kedit Text Eqn aimo RR RR UR RRRRACK dwn KOK OCA GR RR 214 Analog Waveform Icon 00 e eee ee 215 Analog Wave Tool Window leslie 221 Options Window 0000 cece eee 222 Marker Color Window 000 0 cece eee eee 225 Preferences Window Options 205 226 Default Location Window llle 228 New Waveform Window 2 0c eee os 229 Cursor Menu 00000 eee eee es 234 Kalos 2 User Manual XV Figure 146 Figure 147 Figure 148 Figure 149 Figure 150 Figure 151 Figure 152 Figure 153 Figure 154 Figure 155 Figure 156 Figure 157 Figure 158 Figure 159 Figure 160 Figure 161 Figure 162 Figure 163 Figure 164 Figure 165 Figure 166 Figure 167 Figure 168 Figure 169 Figure 170 Figure 171 Figure 172 Figure 173 Figure 174 Figure 175 Figure 176 Figure 177 Figure 178 Figure 179 Figure 180 Figure 181 Figure 182 Figure 183 Figure 184 New Cursa 235 Cursor MeNU o ooccoocooo 235 Change Name Window sssaaa asaan aeaaaee 236 Find Level Window llllsllsl seen 237 Delta Boxes n nananana aana 239 Name Pale coco 239 Markers xa ma KA rata aaa a 249 Pulse Measurement Result MarkersS 252 Display Buttons of the Calculator Area 255 DSP Fu
88. Ptr parm flg 0x0 Ptr result 0 2 Ptr test txt JudgeRes Ptr alarm_id Ptr opt flag OxE Ptr res sca 3 Ptr llm sca 0 Ptr hlm scal 0 Ptr lo limit 0 Ptr hi limit 3 Installation Procedure The Dlog Engine is installed with Kalos 2 Software The Data Engine requires a separate installation 362 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine DE Data Engine installation for the production environment is performed as a standard Windows installation Manual intervention actions are required only to transfer changes from the previous installation and for the engineering environment Data Engine General Installation Procedure This section describes the Data Engine installation procedure using the installation script The Data Engine requires that Kalos 2 Software is installed on the system Following are steps to install the Data Engine in the production environment Exit all Windows applications Run Data Engine installation file SetupDataEngine exe e Wait while setup is preparing for installation e Press the Next button on the displayed Welcome dialog Specify Kalos 2 home directory for Kalos 2 software on the Choose Destination Location dialog Usually it is C 1Kalos which is the default Press the Next button after setting directory Wait while the installation copies files e Press the OK button on the installation completion message box Restore Data Engine previo
89. Selected saves only the selected channels KPL saves the data in KPL format see Figure 192 SRAM saves the data as stored in SRAM The SRAM and EMU combo boxes bellow are active if SRAM is selected SRAM allows the user to save the content of the selected SRAM EMU allows the user to save the content of the selected EMU 328 PN 071 0359 02 October 2005 Logic Debug Tool Figure 192 Save Format UltraEdit 32 C Documents and Settings gbudaghy My Documents Untitled vbd Kalos 2 User Manual 329 5 KITE Utilities The Arm and Trigger Conditions The Arm and Trigger Conditions window allows the user to set arm and trigger conditions and other related settings See Figure 193 Figure 193 Arm and Trigger Conditions Window Arm And Trigger Conditions nA Storage Mode Other Settings Before rm amp Trig 32 v STV Jv Arm First Instruction v Trigger on Fail After Arm amp Trig Jv SOF Trigger First Instruction Arm Condition Trigger Condition Loop Counter 1 Loop Counter 2 Loop Counters lt E E a uRam Address Repeat Counter Cycle Counter Refresh Counter Stack Cycle Counter Refresh Counter Stack LM Address SH a aaa MI I xi Ka Match Counter LVM Cycle Counter Match Counter jo UI Address IM um a a a E ia ba 330 PN 071 0359 02 October 2005 Logic Debug Tool Cycles The Befo
90. Table 28 Mnemonic for 6 Bit of TG Fail Latch 322 Kalos 2 User Manual xxi This page intentionally left blank xxii PN 071 0359 02 October 2005 ABOUT THIS MANUAL This manual describes the Kalos 2 test system from the operator s point of view Information within the manual explains how to prepare a test station for device testing load and run device tests and manage the software system at the test station Included is a description of the system s architecture an overview of the software and instruction on how to use the software tools and utilities Kalos 2 User Manual xxiii About This Manual Scope of Manual This manual contains information for the Kalos 2 test system Information in this manual is intended for use by operators test engineers and test site or system administrators Topics in this manual include Kalos 2 configurations introduction to the Kalos 2 test system An overview describes the major units their features functions configurations and information on the Kalos 2 tester hardware including the test system interface and the test head User operations description of basic user operations including description of the operating environment basic system operation logging on off and shutdown and working with files and folders Test program definitions definition for the Kalos Test Language KTL and Kalos Pattern Language KPL and an overview of the proce
91. This field displays the current vector data by channels PINS see Figure 166 or device pins see Figure 167 in source format editable The column headers display channel numbers or device pins The corresponding names below the channel or pin numbers see Figure 168 can also be displayed from the column header context menus If the names are not displayed point the cursor to the column header to display the name Figure 167 Vector Data Shown by Device Pins Logic Debug Tool File Action Edit View Options Help coho gp D 9 Addr Vector ID TSet Rpt X Jj4A4140000000000000000000000000000000000 B pu 11111 1 2 2 2 2 2 2 3 3 3 F 1 2 3 4 5 6 7 8 9 0 1 2 7 4 5 6 7 8 9 0 1 2 g S IY v N Di i0 38 2 13 E 1 File Action Edit View Options Help E ARM ar mn d d d d EJ MM E 7 a Ds Find HL HH LL H gt E Goto UM e DEVICE PINS shi Add Vector ID TSet Rpt 1 Y G PF viN N 1 2 3 4 5 6 7 8 39 0 a 2 13 4 15 1 Pn00 Pn01 Pn02 Pn03 Pn04 Pn05 Pn06 Pn07 Pn08 Pn09 Pn10 Pn11 Pn12 Pn13 Pn14 Pn 38 1 13 nk 1 0 i O x A A A 0 O o D O D O 0 8 t 39 2 13 1 1 0 0 x D A c D 0 O D D D O D D O D o t FAIL SUMMARY for each channel is shown on the last row of the column see Figure 169 The fail summary for a channel can be P Pass F Fail or X no pass fail information is available see Figure 169 Placing the cursor over the column displays the number o
92. Tools Options 2 Click the Preferences tab 3 Atthe Undo Level tag enter a number between 0 and 32 4 Click OK File Locations To see the default location of different types of files 1 Choose the menu item Tools Options 2 Click the Default Locations tab see Figure 143 Kalos 2 User Manual 227 5 KITE Utilities Figure 143 Default Location Window File Types Location Waveform Files Script Files CAWINNT Profilesigsiddiqu Initialization Script User Scripts OK Cancel Help To change the storage location of any or all of the filetypes 1 Click on the file type then click the Modify button 2 Browse for the desired storage location 3 Click OK 4 Click OK again NOTE Selecting the User Scripts item and clicking the Modify button brings up a slightly different dialog box that allows you to select multiple directories Click OK after selecting the directory Creating a Waveform To create a waveform 1 Choose File 5 New or click the New File icon on the toolbar to open the new Waveform window shown in Figure 144 228 PN 071 0359 02 October 2005 Waveform AWT Figure 144 New Waveform Window LITT x Waveform Type Sine waveform 4 uniform wave that is generated by a single frequency Name sinz Num Cycles M Poo Gaussian Noise Num Samples N fog O i Sample Interval 1 Fs oo In 7 Phase radians bo Amplitude pooo Offset Do Reset default va
93. Two types of test execution are available binary search or linear sweep test Valuelog sequencer has a testing matrix for single selected row or flow testing all rows The Bitmap viewer displays current cell address failures of the DUT This includes two displays MegaMap compressed view and Bitmap uncompressed view BitPower tool optional application allows the user to analyze failed bit information collected at wafer sort The following items are provided under the Help menu This menu item displays the current revision identification of the Kalos 2 software as well as limited system software and hardware information Informs the user of the available versions of Kalos software installed on the system Toolbar The toolbar is an arrangement of graphical icon buttons clustered in functional groups that execute commands and invoke KITE software tools and utilities These buttons provide quick access to the most commonly used commands of the pulldown menu bar 114 PN 071 0359 02 October 2005 KITE Software The toolbar is located directly below the menu bar of the System Front Panel window Figure 72 shows the layout of the toolbar in Engineering mode and lists the commands executed for each toolbar button KITE commands tools and utilities are invoked by a single click of the left mouse button When in Engineering application mode non production all tools are displayed enabled W
94. VLog PMon tool and applications System Front Panel File View Options Utilities Tools Help YH aa e ai 50 430 AE FT OO Graphical User Interface The Shmoo Application tool is executed by selecting Tools gt Shmoo from the Front Panel menu bar or clicking the Shmoo PMon VLog button on the Front Panel toolbar The main Shmoo Application window shown in Figure 249 in its minimized state is subdivided into the following defined operational areas Menu Bar e Toolbar Control Area e Header e View Area Kalos 2 User Manual 453 7 Shmoo and Bitmap Tools Figure 249 Shmoo Primary Window Menu Bar gt rie amp utes Toot Hab 12 Shmao Applicatio n Toolbar gt iE amp Control Area p tren Eso cem 12 t aa 7 lt credence SS File Selects SocketFile Setups Composites VL LLL LLL LLL 2 Header _ Program K2 Shmoo Fmt DATE amp TIME TestName test DOO ID 5 TACC rng INDEX 1ns INDEX 100mY TACC rng 20ns 35ns ELI w lt 0 a J q a J 1 H g L 4v J a 4 View Area H il a L sv HE il a J a il a a a 6v BEBE Et EL ES E E zm ed Dem Est ER Ed ES E E ED EE ES E E ES a zn pn em E pes end n es E TES Den E EST E EE rd t E mi pd e AE Message Area p cno aopleaton Manga MUI OSA PM Menu Bar The menu bar contains pull
95. View Options Utilities Tools Help ed ta 9 a FE oos oN a All Test Debugger editing property pages have some common operations for getting setting and selecting the respective resource for editing These operations are located in the property page s control area top of the selected page The Get and Set buttons if available for the respective property page are for updating or sending the utilities current data table Some of the property pages have an Apply button which is a superior set operation Apply executes the set function and then applies the specific resource table to the Kalos 2 hardware The Break Test button if available for the respective property page allows users to select the Front Panel s Break Test resource or select a specific resource from the currently selected slice program for editing Refer to the Test Debugger chapter in this manual for complete information and details on the Test Debugger utility 212 PN 071 0359 02 October 2005 Kedit Kedit The Kedit utility is a Kalos 2 supplied text editor Kedit is used to generate edit and compile test programs Launching Kedit The Kedit utility is accessible only in Engineering mode That is user login is required Kedit can be launched by clicking on the KTL icon located on the toolbar of Front Panel see Figure 136 or by selecting Utilities gt KEDIT from the menu bar Figure 136 Kedit Icon Click here to launch Kedit Op
96. With the Waveform tool you can Create various types of waveforms Read from and write to waveform files e Modify waveforms using the Analog Wavetool s extensive toolset including the following Display cross hair cursors that are mouse draggable with Ax and Ay values Zoom and pan in both x and y directions Select the number of waveforms to display Perform Digital Signal Processing DSP operations and measurements on waveforms Kalos 2 User Manual 215 5 KITE Utilities Read from and write to waveform resources on Credence high performance testers Create and execute scripts The Analog Wavetool has an extensive library of DSP routines waveform generation templates and multiple waveform displays to output a variety of different waveform formats General Analog Wavetool is a cross platform tool that currently includes Windows XP operating systems The user interface incorporates the Microsoft User Interface Guidelines with screens dialogs and a menu structure that adhere to Windows standards Creating a Waveform To create a waveform 1 Choose File New or click the New File icon 2 Choose the waveform type 3 Click OK Establishing the Current Directory Use the File Save As menu item to establish the current directory The Analog Wavetool remembers this directory until you change it Opening a Command File The File Open menu item is reserved for opening waveforms only
97. a DUT during a functional test pattern vector The pattern data applied to and expected from a DUT during one test cycle PBI Pattern binary interface Files of this type have a pbi extension PE Pin electronics mainly the driver comparator and active load PE ASIC The pin electronics ASIC Each PE ASIC contains four tester channels and provides driver dual comparator and dynamic load circuitry per pin 548 PN 071 0359 02 October 2005 PG pin pinlist PLD PMU pogo pin programmable logic levels PSET PTC PTU PVM resource RISC RS 232C Pattern generator Contains a 2K deep microRAM several scramble memories and muxing circuitry to get an address or I O signal to any Kalos pin Also in the PG are fail counters for ECR mode A metal stem connected to circuitry on a chip to enable external access An array of pin name channel number pairs Programmable logic device the target DUT for the tri level driver Parametric measurement unit A kind of spring loaded pin formed of two small tubular sections joined together with an internal spring and with a contactor formed on the end of the smaller tube used to contact pads on a circuit board The signal and reference voltage levels applied to the driver and comparator rails Period set referring to timing parameters for periods Pull to center a load tied to a voltage midway between a specified high voltage and a specified low voltage Parametric
98. a two sided arrow and dragging it to the desired dimensions Close For an application the Close command is used to quit the application and close any of its opened files For an opened file the Close command closes only the file for which the control was chosen Close Minimize and Maximize Buttons Every window has an x close button in the upper right corner that can be clicked to close the window and quit the program The minimize and maximize buttons are positioned next to the close button Title Bar The title bar spans the top of the application window and displays the application name When a file is opened within an application there may also be a title bar across the top of the file which contains the path and file name Any window can be moved by clicking on the title bar and dragging the window to a new location 30 PN 071 0359 02 October 2005 Software Architecture Status Bar The Status Bar is a single message line that can be seen at the bottom of any Windows XP application window It acts as an interface to the user from the tester to communicate the operations of the associated application If the Status Bar is not present choose View gt Status Bar from the pulldown menu at the top of the application window to display it Shortcuts Shortcuts allow the user to directly launch a specific application without using the Start menu button Creating Shortcuts To create a shortcut go to the Star
99. amp Trig JV Arm First Instruction Trigger on Fail E R After Arm amp Trig iv SOF Trigger First Instruction Arm Condition Trigger Condition KIN NAN Jab I ad Naa aaa Aa AA AA 2 Activate the arm condition by clicking the box then setting the value for the OO CETTE QV CTS MA NR Ina Qo Re Qa ER t ESSET A TN Qao STRA aaa AA INA AA AA a Aa activated arm condition Trigger Save Settings Get Settings Apply Close Trigger is used to establish what event or condition causes the history RAM to stop storing data after N cycles The Before After Arm 8 Trig in the History Ram Control popup window are used for storing N cycles after triggering the event For example setting Before Arm 8 Trig to 32 cycles of data before the trigger event leaves at most 32 cycles that follow the trigger event Changing these two values allows the window of 64 cycles around the trigger event to be moved see Figure 106 The Apply button applies the settings to the currently loaded pattern The Reset button resets the History Ram Control to the default settings Once the settings are made and accepted the user is prompted to click OK in the pop up window shown in Figure 107 166 PN 071 0359 02 October 2005 History RAM Control NorE The window does not allow users to enter a number greater than 63 If the user attempts to enter a number greater than 63 an informative error message is di
100. and click approach When the Omni selector is set to ALL entering a value changes all the Omni ASICs Typically the Omni selector should be set to ALL Slice Views Slice views show non channel resources that are not part of the Omni ASIC The slice selector on the ShowBitz toolbar selects which slice is displayed Only one slice at a time can be viewed or modified Slice views are interactive and allow users to instantly change the hardware with a point and click approach Register Views E Register views show the contents of a single tester register or related group of registers The register views encompass every register in the tester Registers are organized in the navigator exactly as they appear in Sierra the bit chart viewer Kalos 2 User Manual 413 5 KITE Utilities Protected Views T Other hardware views windows display the tester registers in a protected form The hardware contents can be viewed but not modified Shortcuts View Toolbar Similar to the navigator the shortcuts view lists the names of interactive and protected views A view can be launched by clicking on a name in the shortcuts view Unlike the navigator which arranges the tester architecture in a tree the Shortcuts view is a web linking the views together All views can be linked together There are hundreds of built in links in ShowBitz In addition as the navigator is used to launch views the old and new views are linked to each ot
101. as Right Delta Cursor Zoom to Cursors gt Zoom to Region Find Level Set Track Cursor gt Remove Track Cursor The pop up menu contains the name of the cursor Thus a cursor can be identified without moving it This is done by pressing the right mouse button near the vertical cross hair of the cursor 2 Using the guide below choose the action to perform the desired changes Kalos 2 User Manual 235 5 KITE Utilities Change Name Allows you to rename the cursor as shown in Figure 148 Figure 148 Change Name Window Cursor Name cursor 0 OK Cancel Help Change Color Enables you to choose a new cursor color from a color palette Remove Cursor Deletes a cursor Set as Left Delta Cursor Sets the selected cursor as the left cursor in the Delta area upper left corner of tool for comparison Set as Right Delta Cursor Sets the selected cursor as the right cursor in the Delta area upper left corner of tool for comparison Zoom to Cursors Adjusts the X scale factor and position such that the waveform is centered between the cursors and the cursors are one minor division tic mark from each end If more than two cursors are defined a list of cursors is provided If the two cursors are on the same data point the scale is adjusted so that one sample interval fills the entire display Zoom to Region This works the same as zoom to cursors but the Y scale and positio
102. be used to detect all failing tests in the test flow 1 Load the desired test program and select a flow For this example the flow loaded is as follows FLOW failing flow test name pass branch fail branch Opens Shorts Bin2 Shorts InputLeakageHigh Bin3 InputLeakageHigh InputLeakageLow Bin4 InputLeakageLow OutputLeakageHigh Bin5 OutputLeakageHigh OutputLeakageLow Binb OutputLeakageLow IccStandbyHi Bin7 IccStandbyHi VCCReadICC_CMOS Bin8 VCCReadICC CMOS VCCReadICC TTL Bin9 VCCReadICC TTL Read dut ID Bin10 Read_dut_ID Erase array Binili Erase array Read all ff Binl2 Read all ff Write 5555 WORD Bin13 Write 5555 WORD Read 5555 WORD Bin14 Read 5555 WORD erase block0 Binl5 erase block0 readff block0 Binl6 readff block0O Write AAAA all Binl7 Write AAAA all Read AAAA all Bin18 Read AAAA all Write 5555 all Bin19 Kalos 2 User Manual 175 4 Introduction to KITE Kalos 2 Integrated Test Environment Write 5555 all Read 0000 all Binig Read 0000 all Erase arrayl Bin20 Erase arrayl Read all ffl Bin21 Read all ffl Write CKBD all Bin22 Write CKBD all Read 0000 alll Bin23 Read 0000 alll Write CKBD all Bin24 Write INVCKBD all Read 0000 a112 Bin25 Read 0000 all2 Binl Bin26 H NOTE Write CKBD all programs the entire array to a checkerboard pattern Therefore Read 0000 all1 the subsequent test in the flow fails 2 S
103. bin file row by row This information includes Bin Name Sort Hard Bins Counter Soft Bins and PASS FAIL Designation Kalos 2 User Manual 431 6 Test Debugger Figure 232 Flow Property Page Bin Table Control Area Display Area Flow Table The Flow Table displays the flow of the current test program in spreadsheet format see Figure 233 The information listed in each column represents a test sequence made up of the Test Name with its respective Pass Branch Test or Bin and Fail Branch Test or Bin conditions This view does not confirm that the flow is correct but simply shows the currently selected flow of the loaded 432 PN 071 0359 02 October 2005 Property Page Functions Figure 233 Flow Property Page Flow Table Ed Test Debugger Application Flow Diagram The Flow Diagram combines the Flow and Bin Table see Figure 234 This is compiled resulting in a graphical view The graph displays the layout of the tests and bins for the current test program as a flow chart Objects which represent tests and bins are connected by green and red lines which represent pass and fail conditions respectively The test for which the breaktrap was set in Front Panel is highlighted in turquoise There are two control buttons under the graphical view Scale and Gr
104. can now modify the levels format and timing and click on the Run button of the PG Burst window to run the Read_CKBD_all pattern with the modified settings Kalos 2 User Manual 179 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 111 Pause Step ShowBitz Eset View ShowBitz Module 0 File Edit View Options Window Help Heo eH NA amp n5wej BBuL ce amp t Slice A00 y Dut Hex v OMNI 0 j o y Default al El Eset View ae empereur 8 Start at Uram 0 Fu 0 0ns DL 0 0ns DL 0 0ns DL 0 0nS DL Mode Store All z Stop Dly DOS DL CA LS LS E Cycle oxo0000009 32 mid 0 0nS DL 0 0ns DL Gons DL 0 05 DL E CT Pass Fail Results 0 0nS DL 00nS DL OOS DL 00ns DL O 0ns DL 0 0ns DL 0 0ns DL OSDL Pass Fail R DonsDL AS LOS DL OOS DL E fof onl ol om F oons DL Ors LMS DLS OL options History Ram 0 0nS DL 0 0nS DL 0 0nS DL 0 005 DL oons DL oos DL D sDL NS OL Oos DL OS LOS LCS OL oons ot OSD O0nSDL OS OL oons DL QOsD X OSDL DNS OL oons oL AS DAS OL Omsp a im ES E EE Ea SN EEN one uem on Omni Views i i URAM 0 005 DL 0 0ns DL 0 0ns DL DNS DL Eset View 0 0nS DL Q sSDL OS OL QDns DL 1 EE ES E xat TAAA ES d T S AUD E Error Logic 0 0nS DL 0 0nS DL 0 0ns DL 0 0nS DL TG PassFail view 0 0ns DL i 0 0ns DL 0 0ns DL i 0 0ns DL E TG vector PassFail View ILAN R
105. compile then begin with step 1 above Debugging KPL Source Code in Kedit The history RAM can also be viewed from Kedit which allows users to more easily debug patterns within a test program Kedit can only launch the History Ram Control window once the debugging tools are launched Debugging tools that are launched from Kedit can debug C source file code as well as pattern code within a KPL file The tester must be powered on and the Target Manager launched and communicating with the tester in order to launch debugging tools in Kedit see Figure 43 76 PN 071 0359 02 October 2005 Kedit Figure 43 Target Manager Tester Communication oq Although it is not necessary launching the Front Panel and the Cview utility are helpful in allowing users to track tester functions and view results of the test program being debugged The Datalog property page should be viewed by the user during the debugging NOTE The Front Panel is used as a viewer only when debug tools in Kedit are in use Next get the editor online using the online button on the Kedit toolbar as shown in Figure 44 Kalos 2 User Manual 7T 3 Test Program Definition Figure 44 Online Load Buttons Offline Online Load Project and Load Program buttons List of Active Modules Once online choose the slice that is to be debugged Load the test program or project file that is to be debugged by pressing the load program kb
106. corresponding information can be saved to a lat file which can be opened in both online and offline modes through the context menu of the LATool window The first column shows the names of the selected pins and pin groups symbol next to a pin group name indicate that the pin group is expendable Click or to expand or collapse a pin group Expanded Pin Group If a pin group is expanded then the names of its pins are shown bellow the pin group name The channel number and device pin number corresponding to a pin are shown right to it in the second column The following columns show the corresponding waveforms waveform area They show the states Low Midband High of the selected pins at the cycles the numbers of which are indicated in the Cycle row The total number of the shown cycles may be 64 at most Kalos 2 User Manual 309 5 KITE Utilities Users can double click any channel waveform at any cycle to open the Detailed Information dialog showing detailed information on that part of the waveform refer to the Detailed Information Dialog Collapsed Pin Group If a pin group is collapsed then the corresponding hex values of Exp Hi Exp Low for each time edge as well as Act Hi and Act Low for each period of steady actual value are shown in the waveform area The expected and actual values are shown in blue and black correspondingly in case of no fail and both in red in case of occurred fail Waveform
107. cursor is moved to the next data point The waveforms are redrawn if the new location is off screen If the cursor for a cursor box is scrolled off the screen entering a return in this box causes the screen to snap to that cursor position in the waveform If the cursor is not assigned to a waveform it is assigned to the top of stack waveform To move a cursor by dragging its cursor box Click and drag on the label of the cursor box Attaching a Cursor to a Waveform Cursors are normally attached to a waveform When a cursor is moved from one waveform to another the cursor now attaches to the new waveform If however you pop remove the TOS waveform off of the stack a waveform that a cursor is currently attached to that cursor becomes unattached its X and Y value fields become blank and the cross hair is removed from the screen To reattach that cursor to a waveform move to the label in the cursor box press the left mouse button drag down to the waveform that you want the cursor attached to and release the button The cross hair and numbers in the X and Y value fields will reappear Understanding the Delta Information Two delta boxes are located in the upper left corner of the Analog Wavetool window See Figure 150 238 PN 071 0359 02 October 2005 Waveform AWT Figure 150 Delta Boxes v To Cursor 5 Y Delta 1 0000 Tal X Delta 154 0000 lsb 1ix 6 4935 m anish To view the delta information about
108. d edt 198 Mapping Active Kalos Slices 0 00 ccc tees 198 Device Testing Procedure 22 2006 secede eee mnm mra mk eee eed 200 KITE Utilities c oss ue REI Sued Ru EE ROUGE A FRE SETS UR PEE EUER V RES 207 OVE 17 pegent isi DUREE 208 A TP 208 CView Console Viewer xxx s E RRERG Rede A acere RS dod RR Rea 209 CView Window emi AA Waah APE bs CRURA CE atea dis 209 Menu and Toolbar ciusutas sh RG dre e EO Seabee des 210 Test a a Us PE Dr 212 Kedit ici a E A GAN A RA RRA Rew GA 213 LAUNCHING Kedit codes co aii eec Er AR 213 Program Loading AA Co no o aee acorde UR ala Pp 213 WAVEIOMLIAW dB PI a raat e R a aE a ia aR AA a a 215 Introduction EE 215 General uec mee p rritik bnp ie WG KG AKA 216 Operation si suce ee e CEobs TU ERE aded E goce a bo dup ani d 219 Waveform Filetypes ram RE ERA CHECKED HRRUR RA AUR HA eee aed 219 User Interface cuentas obrui e PR or m RUN RR e Don ees et dos e 220 ribs A piaia KR a e aS aa A E a e a as A Aa A 222 Kalos 2 User Manual v Drawing Ue maganit kaa Aa A 223 Display Mode Xa mag eras RRA e ARAN 223 Graticule Setting acct ncasdhadecwer 4axweResreeddeeoty oh eate wees 223 Slack Display Order accio asker sa es ket beheawiaked CR CRACK n 224 Synchronize Y Axes a sas eee so xk e a wed 224 Synchronize on Scroll s e aca deiode oce AA 224 Background Graticule or Marker Color 020000005 224 CWaveform Colors 1 02 Sn dura Eo En Row IHRER A bow UR ade 225
109. down menu to select the EdgeSet used by the breaktrap 3 Table shows the currently selected EdgeSet 500 PN 071 0359 02 October 2005 Pin Monitor 4 EdgeSet selects the EdgeSet number from the option list on which the breaktrap is set Period shows the Period value used by the selected edgeset EdgeSet Index shows the edgeset number used by the selected edgeset 7 Channel Formats Times shows each tester channel with its pin name and the programmed value of each resource Socket Window The Socket window provides a view only display of the automatically inherited socket file from the test program loaded in Front Panel This display allows the user to observe the DUT pin to tester channel assignments of the test program Information concerning address steering and data bus width is also provided See Figure 282 for the layout of the Socket window Figure 282 Socket Window 12 Shmoo Application Kalos 2 User Manual 501 7 Shmoo and Bitmap Tools Explicitly Defined Versus Inherited Resources Resources such as the Level Table EdgeSet and DPSSET may be retrieved by explicitly defining them within the test block or they can be inherited from a previous test block Read test explicitly defines these resources within the test block as follows TEST Read test TESTNO 1 DESC Standard Read Test SEQUENCE normal dps Explicitly defined DPSSET read levels Exp
110. eee eee 133 Summary Bar Chart euge aoa ee Kana WON Pe RR CGR A ac 135 Summary Pie Gharls 2 ccce ss n hh reme 136 Text Summary and Wafermap File 137 Wafermap Functional Diagram lille 138 Wafermap Tool lr 139 Sort Property Page xoc ri detnr eR PARANG Kani 140 Mask Editor Property Page lt lt ooooooooonmmo 141 Interactive Wafermap essen 143 Datalog Property Page sic ee ecc RR Cice 145 DataLog Property Page Setups 20 148 Datalog Property Page Histograms 149 Yield Monitor Property Page 0 152 Engineering Property Page o oo ooooooo 153 DBM SRAM Viewer lilius ER Rx Rh es 157 History Ram Control From Front Panel KDatalog Icon 158 History Ram Control From Datalog Property Page 159 History Ram Control Window aaa 160 History Ram Control Default Settings 163 Setting Arm Conditi0NS lt co oooooooooooooss 166 Setting Trigger Conditions llli 167 xiv PN 071 0359 02 October 2005 Figure 107 Figure 108 Figure 109 Figure 110 Figure 111 Figure 112 Figure 113 Figure 114 Figure 115 Figure 116 Figure 117 Figure 118 Figure 119 Figure 120 Figure 121 Figure 122 Figure 123 Figure 124 Figure 125 Figure 126 Figure 127 Figure 128 Figure 129 Figure 130 Figure 131 Figure 132 Figure 133
111. equal to the duration of the selected cycle Click the Zoom Wnd button the mouse cursor turns to and drag the mouse cursor over the desired area of the plot to zoom and fit it to the whole plot area Click the Details button to open the Detailed Information dialog Levels Group This group indicates the LEVELS KTL statement which is used for the selected pin the voltage values defined in that statement as well as the conventional color of each level used in the voltage plot Cursor Group This group indicates the Time and Voltage values corresponding to the current position of the mouse cursor Measure Group This group indicates the Time and Voltage ranges corresponding to the space you have dragged the mouse from one point to another in the plot area Thus the DSTool window allows the user to measure the time and voltage intervals between any two points of the plot Kalos 2 User Manual 315 5 KITE Utilities Datalog Window The Datalog window allows the user to view the data stored in History RAM Figure 179 Datalog Window Logic Debug Tool File Action Edit View Options Help laj 119 1 Em SS oo A A AA RUN STOP Find H gt L HH LL H gt E D D D D D D D D D D D D Si XI XI TAI Si I i I XI XIX AAA bag i Pag 5 af j Pagi bagi fafi bago bagi Magi mii MMMM 1041010010460 L0 OM PG bM L5 MG MG MI MG MG MG MG X LX LDTool WaveForm LATool NA eae a a Ready N A 96x4 ON
112. hair horizontal line When you modify waveform data results markers are updated Figure 153 Pulse Measurement Result Markers All result markers defined in the pulse parameter pop up shown in figure Figure 153 are listed in Table 15 Table 15 Result Markers High The high value of the pulse as computed for pulse amplitude Low The low value of the pulse as computed for pulse amplitude Proximal The proximal point of a rising or falling edge Mesial The mesial point of a rising or falling edge 252 PN 071 0359 02 October 2005 Waveform AWT Table 15 Result Markers Cont Distal The distal point of a rising or falling edge Rise The peak value in a pulse after a rising edge If the peak occurs in Overshoot or the first half of the pulse it is assumed to be overshoot from the Fall Preshoot preceding rising edge If the peak occurs in the second half of the pulse it is assumed to be preshoot from the following falling edge Fall The peak value in a pulse after a falling edge If the peak occurs Overshoot or in the first half of the pulse it is assumed to be overshoot from Rise the preceding falling edge If the peak occurs in the second half Preshoot of the pulse it is assumed to be preshoot from the following rising edge Note Marker A note marker is displayed in the same manner as a results marker with a cross hair at the location specified by the X and Y coordina
113. interact with the Kalos 2 system hardware at a register level for debugging purposes Refer to the Reference Manual located under the Help menu of the ShowBitz utility for additional information Provides the user with non volatile program memories information Motherboard PMU DPS DAC SRAM slice and ETX The Non Volatile Memory NVM on the Device Interface Board DIB is a small memory located on the test hardware that contains identification and configuration information needed by the test program Monitors the electrical state of the tester system in terms of voltage current and temperature readings The MAP INIT selection brings up the MAP Initialization dialog box that allows the user to select all slice The Tools menu item includes the following KITE external support application tools Kalos 2 User Manual 113 4 Introduction to KITE Kalos 2 Integrated Test Environment Table 7 Front Panel Menu Bar Description Cont Option Function Shmoo PMon VLog Bitmap BitPower Help About FrntPanel Version Check VCheck The Shmoo menu item launches the Shmoo Plot tool which supports 1 2 and 3 dimensional shmoo plots The Pin Monitor PMon allows the user to evaluate the performance of a DUT on a per pin basis The evaluation is performed by creating one dimensional shmoo plots of each resource that is allocated to a pin VLog ValueLog provides an AC datalogger
114. interface controls 28 Windows XP environment 34 folders 34 p working directory 21 This page intentionally left blank working with cursors 233 Workspace 61 workstation computer 553 X scale 242 X scroll 246 X Select shmoo 462 XY Origin 460 Y scale 243 Y scroll 245 Y Select shmoo 462 yield 553 Yield Monitor 151 Z Select shmoo 463 ZIF 553 zooming to a region 236 zooming to cursors 236 566 PN 071 0359 02 October 2005
115. investigate and change parameters of the Kalos 2 tester hardware using a device program test as the template With this utility users are able to read back and change test data without the need to re compile or reload the test program It allows the flexibility needed for interactive creation and debugging of test programs while online The effect of changes are seen immediately and turn around time for the creation of new test programs is reduced Test Debugger uses the current test program as a template and requires a set breaktrap in Front Panel to read test components Features of Test Debugger include the following e Both text and graphical viewing capabilities for flow sockets tests levels and timing data of the selected test at the specified break point The ability to modify the specific components of the selected test Linkage for support of other tools such as Shmoo Online operation capabilities only The Test Debugger utility is launched by clicking on the Test Bugger icon see Figure 224 or it can be selected launched from the Utilities TBUGGER menu item Figure 224 Test Bugger Icon Click here to open the Test Bugger utility ptions Utilities Tools Help p Bey 3 50 O Ha I as gam Ue A Release compile option located in Kedit restricts user access to the Test Debugger utility once a program is compiled The Compile Options pulldown chosen from the Kedit menu bar is shown in Figure 225
116. is a read only data container engineering tool If a prober dll is loaded then two summary types are made available to the user a standard text summary and the optional text wafermap see Figure 89 Printouts are available for both summaries standard text summary file smy and the wafermap file wmp The Kalos 2 tester is the master while the prober is the slave Testing is controlled by the Kalos 2 tester while the prober moves across the wafer A driver is loaded by way of the System Front Panel application Device IF property page Depressing the Start button loads the Site Mapping File SMF Once the driver is loaded the tester is put into automatic mode From this property page you can pause and restart the test Keep in mind that if the test is paused the prober should not be touched If another site is chosen the tester will continue testing from the point the test was paused NOTE The driver that is used may or may not use a mask of the Wafer This depends on the driver 136 PN 071 0359 02 October 2005 KITE Software Figure 89 Text Summary and Wafermap File GM am o Sa Ammo u 09000000000000000000000000 2 00000000000000000000 Text summary Wafermap graphic The information received by the Wafermap is used to generate the map This data comes from the prober and the tester The prober supplies the X and Y coordinates while the tester supplies the binning sort and s
117. is open click on the Socket File property page tap then click on the Get Online button to load the test program socket table into the Shmoo application Step 4 Click on the Property page tab marked Setups Step 5 Select Edit gt New Setup from the menu bar Enter TAA neg index for the name of this setup table In Figure 272 the read cycle of read AAAA fast pattern illustrates that the strobe occurs at 80 ns Therefore in order to measure the minimum t4cc of the 16 M device the user must move the edge of the DBUS in negative time from 85 ns to 45 ns By moving the edge of the DBUS in this manner tace varies between 80 ns and 40 ns offset of 5 ns from address TI Next select Edit gt Add Time Element Under Pin Pin Group Symbol select DBUS Under Type select TIM Under Set select 3 Under CycleName select read tight cycle In KTL the TSET used is tset4 Sets in shmoo are defined as Set 0 Set 1 Set 2 and so on TSETs in KTL are defined as tset1 tset2 tset3 and so on Therefore Set 3 in the Shmoo tool corresponds to tset4 in KTL Under Resource select T1 EDGE Under Start enter 85 ns tacc 7 80 ns Under Index type 2ns This moves the edge backward 2 ns for each shmoo point The Stop is grayed out because it is a view only field Next enter the Axis Printout Start value Index value and steps For this example set the Start value to 80 ns set the Index value to 2 ns and set the number of Steps to 20 NOTE
118. k f SOCKET fh CYCLE N f CMODULE BINTABLE bins x PINGROU bin name hard bin soft bin PASS FAIL a CONSTAN Bini 1 A PASS V VARIABIL Bin2 PASS Hi Fu DPSSET Bin3 FAIL Bin4 FAIL Kb PHUTEST Bins FAIL Th LEVELS Bin6 FAIL hh TSET TA Bin FAIL T FSET TA Bins FAIL e Ed PSET TA Bind FAIL a th CYCLE T BiniD FAIL 5 fa TIMING Binii FAIL a AXIS Bini2 FAIL js Bin13 FAIL Ea SHMOD Bin14 fa VLOG Bin15 Eh PATTERN Bin16 f LOADDBM Bin17 ohh SEQUENC Bin18 FAIL E f TEST Bin19 FAIL oro Bin20 5 n FAIL E m Program FAIL FAIL FAIL FAIL Q0 1 Q Q CO CO O CO C0 CD D QD C n b CO 9 Compiler Dutput Find in Files For Help press F1 Ln 2475 Coli Not connected NUM Flow Statement A flow statement defines the order in which tests of a Kalos 2 test program are executed and the manner in which tests and bins are connected When a test is executed it results in a pass or a fail Based on that result the flow branches to another test or a bin Typically when the test passes the flow directs the system to go on to the next test until all tests are executed When the device is assigned a pass bin testing stops When a test fails the device is assigned a fail bin and testing stops without performing other tests As shown in Figure 33 the flow statement consists of three columns The first column contains the
119. k kk kk KK KR KK KKK KK KK KKK KK KK KKK 4671898 k KKK KK KK KK KK KKK kk kk KKK kk KK KK KK 56788 XX kk KK KKK KKK KKK kk KK KKK kk KK KKK 678888 k kk kk KKK kk KK KK KK KKK KK KK KKK KK KK 1 899 9 x X k kk k kk kk kk kk kk KKK kk KK KKK KK KK KKK 656 D k kk kk kk kk k kk kk kk kk kk KKK kk kk ok kk 55566 X kk kk kk kk kk kk kk k kk KK KKK kk KK KKK 555556 X kk k kk kk kk kk kk k kk kk kk kk KKK KK KK 445555 XXX kk kk kk kk kk k kk kk kk KKK kx x KK 4444445 kk k kk kk k kk KK KKK KKK 444445 X kk KKK KK KKK kk kk kk kk kx 3334444 kk kk kk KKK kk kk KKK KKK 33334 kk kk KKK kk kk kk kk x x xx 22223 k kkkk kk KKK kk kk KKK KK KK L2L 22 ZK KK KK KKK KKK KK KK KK KK KK KK LLL 222K KKK KK KKKKKKKKKK KKK KKK 1111111111 x x x x x 50 20 Date Options Stop Stop Total Kalos 2 User Manual 477 7 Shmoo and Bitmap Tools Figure 264 Accumulate Passed Threshold Plot Value 50 Program filename Ser 1 Lot 1 Date mon day year time Comment user statement Level tablename Time tablename Pattern sequencernam Options X Axis VariableName Start 10 00nS Index 0 500nS Steps 50 Stop 35 00ns Y Axis VariableName Start 5 000 V Index 0 125 V Steps 20 Stop 1 000 V Accumulate Passed Threshold Value 50 0 Plot Total Tested 250 Space 0 Threshold gt Threshold 5 000 V KIKKIAKKAKKKAKKAKKKAKKAKKKAKKKX ACKCkCk ckCkCckck ck ck ck c
120. keeps testing until it finds the first pass Then it will not test the next five datapoints If the fifth datapoint tested is a pass then once again the next five datapoints are not tested the system assumes the points not tested are passing datapoints If however the fifth datapoint tested is a fail the system goes back to test every point that it skipped in the last five datapoints until it finds another passing datapoint at which time the skipping process starts again 490 PN 071 0359 02 October 2005 Shmoo Plot Example The Select Property page is shown in Figure 275 Figure 275 Selects Property Page D Shmoo Application File Edit Utilities Tools Help sae DER test stop Clear id Program nor demo TestName ID TAA START 155ns vec START 1 V INDEX 1ns INDEX 100mY October 31 2003 03 07 PM STEPS 70 STEPS 15 STOP 225ns STOP 25V Shmoo Selects XY Origin Axis Selects C Top Left Corner EJ Bottom Left Corner C Top Right Corner C Bottom Right Corner Types O 1 Dimensional Shmoo X Only Normal Shmoo BINARY LOG BIN LINEAR LOG LIN El 2 Dimensional Shmoo X amp Y Normal Pass Fail Shmoo PMU Plot DPS IMEAS Plot C 3 Dimensional Shmoo X Y amp Z O Fail to Pass Sweep Q Pass to Fail Sweep ASCII Outputs O Standard PASS Non Tested Failed O Optional C PASS Non Tested Failed
121. measured values Accumulate operational mode for all plots except three dimensional ASCII file operations including import setups export setups and print support Support for online and offline setup import export operations The Shmoo tool includes multiple applications The Shmoo tool is the top level operation that incudes Pin Monitor and Valuelog property pages The Pin Monitor is an application which allows the user to evaluate the performance of a DUT on a per pin basis The evaluation is performed by creating one dimensional shmoo plots of each system resource that is allocated to a pin This provides detailed information for the device margins with respect to the system resource and is also helpful in debugging applications The Value Log application provides an AC Datalogger that is available on Kalos 2 test systems Two types of test execution are available to users a binary search or a linear sweep test The result is determined by the selected Setup and is the pass point at the detected fail pass region 452 PN 071 0359 02 October 2005 Shmoo Tool Shmoo Tool The Shmoo tool is accessible only in Engineering mode That is user login is required The Shmoo tool can be launched by clicking on the Shmoo PMon VLog icon located on the toolbar of Front Panel see Figure 248 or by selecting Tools gt Shmoo PMon VLog from the menu bar Figure 248 Shmoo PMon VLog Tools Click here to open the Shmoo
122. measurement range by an automatic instrument so it can report with best accuracy a quantity at its input Kalos 2 User Manual 541 A Glossary of Terms B bidir board board controller breakpoint channel characterization test chip clamp voltage CMOS comparator compare compliance voltage continuous active load cycle time Bidirectional access Input output or I O used in phrases like bidir pin A single Kalos tester circuit board The dedicated controller for each Kalos board It is an Intel Pentium microprocessor with 32 bit register based RISC architecture The Test Program Executor portion of the Kalos Test Language software resides on each board controller A point in a program where execution is suspended so that one may examine partial results The tester functions and the path through a pingroup card and DUT fixture dedicated to one DUT pin A series of tests designed to determine the operating regions and reliability of a device under varied operating conditions Jargon for a packaged device a synonym for die or integrated circuit IC A fixed voltage coupled by a diode or its equivalent to limit the voltage excursion of a transition or a current supply Complementary medal oxide semiconductor A circuit whose output is a digital logic level that depends on whether its input signal is above or below a threshold at a specified time interval Application of functional data to a
123. must be used Within a C Hook this allows for changing the test name just before executing the TPEJudgeResult function This distinguishes results coming from TPEJudgeResult by giving the test a unique name and to enable storage of multiple computed test results in separate STDF fields NOTE Use caution when using TPESetTestName After the computed records are calculated executed in the C Hook and logged in the STDF fields it is critical to change the test name back to the name used in the flow Following is an example tpe example c include chook h const REAL EXT VX START 8 0 const REAL EXT VX STOP 5 5 RESULT JudgeResult void ELEC meas llim elec ulim elec LIMIT llim ulim assign variables for inserting STDF records meas volts 1 meas amps 0 meas secs 0 llim elec volts 1 llim elec amps 0 llim elec secs 0 ulim elec volts 1 ulim elec amps 0 ulim elec secs 0 llim elec value EXT VX START ulim elec value EXT VX STOP ElecCpy amp llim limit amp llim elec llim type K CHECK ElecCpy amp ulim limit amp ulim elec ulim type K CHECK to ignore a limit use K IGNORE instead of K CHECK TPESetTestName original testname 1 TPEJudgeResult amp meas amp ulim amp llim return PASS In this example STDF logging is accomplished by using the EVENT MAP which swi
124. not been generated as there are no devices tested n return 1 Even though there will be no summary file this is a successful return location therefor return 1 j if kdx get device info amp devInfo false return 0 fname kdx get output file fp fopen LPCTSTR fname w if Hp kdx printf kdx_summary file Yos open error n LPCTSTR fname return 0 j kdx printf Opened summary file Vos LPCTSTR fname Generate summary file header fprintf fp Tester ID s n kdx get machine id fprintf fp Tester Type s n kdx get tester type fprintf fp Interface s n devInfo model fprintf fp Date s n kdx get start wafer time str 96d b Y H M S8 fprintf fp Program s n kdx get program name fprintf fp Device s n kdx get device name fprintf fp Flow s n kdx get flow 1d fprintf fp Lot s n kdx get lot id if kdx_isWafer fprintf fp Wafer ID s n kdx get wafer id Kalos 2 User Manual 407 5 KITE Utilities fprintf fp Wafer Num Yodin kdx get wafer num fprintf fp Operator s n kdx get operator id fprintf fp User Text s n kdx get user text fprintf fp Users C Yosin kdx get user comment fprintf fp Site s n kdx get runtime str test site Generate wafer summary num good kdx get good part count num failed num tested num good
125. not loaded after Dlog Engine startup files will not be generated Dlog Engine receives socket table bin table and flow information at test program loading Files generated without that data contain improper data In offline mode files are always generated Icon Displaying Enabled Disabled State The Dlog Engine icon changes displaying enabled disabled state as shown in Figure 214 disabled state indicates files will not be generated State is always enabled in offline mode and may be disabled in online mode in the following cases Runtime connection failed e g TTarget was not started Kalos 2 User Manual 361 5 KITE Utilities e Selected flow is disabled Test program is not loaded after Dlog Engine startup Figure 214 Dlog Engine Icon Enabled Disabled States Kalos Dlog Engine Kalos Dlog Engine en A 11 10AM Oi NA 11 12 am Enabled state Disabled state STDF Viewer Utility A STDF file viewer stdf2ascii exe is supplied with the DE utility This command line utility translates STDF to a text file The following command line translates input std to output txt stdf2ascii f input std 5 output txt The generated file format appears as follows REC LEN 2 REC TYP 5 REC SUB 10 Pir head num Pir site num 0 REC LEN 46 REC TYP 15 REC SUB 10 Ptr test num 10 Ptr head num Ptr site num 0 Ptr test flg 0x0
126. of the a pulldown lists and or text edit boxes Both are activated by a single left mouse click in the respective table area NOTE As with all Kalos 2 applications any field that is white in color can be edited while grayed out fields or options are either read only or unavailable The METE and all tracking parameters have individual start index and stop values with a common steps value Although they all have entry points only the following equation is used for each parameter entry start value plus index value times step number equals the stop value If the user wants to control the parameter range by inputting the stop value instead of the index value then the step number must be entered before any stop value entries Changing the step number or the index value changes the respective stop value Search Tables Fail User Property Page The Search Tables Fail User property page is used to search and display failures Physical addresses of failures are listed in a text type table The error is listed by row or column preference selected from the Listing Criteria option as shown in Figure 310 The measurement cell current from the bitmap feature allows the user to measure cell current at a failing address using the system PMU Note that there must be syntax within the pattern to allow this feature to work Also a breaktrap setting of BreakOnSeq must selected by way of Front Panel 534 PN 071 0359 02 October 2005 B
127. section Kalos 2 User Manual 255 5 KITE Utilities Clear Clicking this button removes all waveforms from the stack Push Clicking this button pushes a copy of the TOS waveform onto the stack Pop Clicking this button removes the TOS waveform off of the stack Push2 Clicking this button pushes two waveforms TOS and next to TOS onto the stack together This is quite useful when both components of a complex or polar waveform are on the stack Swap Clicking this button exchanges the TOS and the next to TOS waveforms Rotate Down Clicking this button rotates the stack down one This causes the element on the top of the stack to be placed on the bottom of the stack and the next to TOS becomes the TOS Rotate Up Clicking this button rotates the stack up one This causes the element on the bottom of the stack to be placed on the top of the stack Concatenate Clicking this button takes the TOS waveform and concatenates it at the end of the next to TOS waveform producing a single waveform with a length that is the sum of the lengths of the two original waveforms Segment Clicking this button creates a new waveform based on a segment specified on the current TOS waveform If one or more cursors exist there are three ways to designate the values The segment between any of the following can be designated 256 PN 071 0359 02 October 2005 Waveform AWT Two cursors unless there is only one cursor e One curso
128. sine waveform with the given parameters create triang name string rate double cycles int points int start double rise double fall double amp double offset double Creates a waveform consisting of triangular cycles with the given parameters cursor track lt string gt lt string gt Set the second named cursor to track the first named cursor cursor untrack lt string gt Remove cursor tracking from the named cursor decimate factor int Decimate the top waveform on the stack according to the indicated factor deinterleave name lt string gt interleave factor int TBD decode number bits int code format int Decode the TOS waveform according to the specified number of bits and code format If code format indicates a law u law or BCD the number of bits is not used differentiate Differentiate the top waveform on the stack display colors print normal Set the display colors to print black on white or normal display marker lt string gt on off Enable or disable the display of the named marker display mode user points Set the display mode to user units or points div Divide the top waveform on the stack by the next waveform on the stack div const wf const double Divid
129. start voltage after sample time which the ramp decrements increments toward the stop voltage The triangle waveform parameters are described in Table 10 Table 10 Triangle Waveforms Parameter Name Name associated with the waveform wavelet Num Cycles M Number of complete waves to display One cycle equals one complete wave Samples per Cycle Number of points per cycle used to create the waveform 230 PN 071 0359 02 October 2005 Table 10 Table 11 Waveform AWT Triangle Waveforms Cont Parameter Sample Interval 1 Fs Meaning Time that is to elapse between samples Start Delay Length of time to wait before beginning the sample Rise Time Time required for the output of a circuit to change its output from a low voltage level 0 to a high voltage level 1 after the change starts Fall Time The measure of time required for the output of a circuit to change its output from a high voltage level 1 to a low voltage level 0 after the change starts Amplitude The magnitude of variation in a changing quantity from its zero value Offset The relative location from zero on the Y axis at which to begin the drawing of the waveform The sawtooth waveform parameters are described in Table 11 Sawtooth Waveforms Parameter Name Name associated with the waveform wavelet Num Cycles M Number of complete waves to display One cycle
130. stream refer to Kalos 2 External Datalogging Overview Data is received by messages Each message is a structure containing several variables For example start wafer message contains lot name wafer number and wafer ID All configuration settings of DE are stored in the kalos production ini file INI file which is located in the 5KALOS HOME Test DevicelF directory KALOS_HOME is the Kalos 2 software install directory which is C Kalos by default refer to Configuration with kalos production ini also see Figure 209 DE mainly consists of one main EXE file and several DLLs The main EXE file is responsible for receiving data from Kalos 2 datalog stream refer to Kalos 2 External Datalogging Overview processing it and exporting it to DLLs Each DLL is responsible for specific file format creation There are several standard DLLs delivered with DE Users can also add DLLs for custom file format generation 354 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine Figure 209 DE Structure Datalog Wafermap files Postprocessor Summar Postprocessor kalos production files INI Shmoo files ASCII files Postprocessor Postprocessor User format Postprocessor Data Engine files Standard DLL formats are e STDF 4 Standard Test Data Format file Wafermap multiwafermap file Summary file for wafer and lot e Shmoo file for wafer e ASCII text file The ASC
131. string bonstchart amg e de representation for const char fmtStr Time Date format like wafer start Time Date 96b 96d 96Y 96H96 for strftime standard M S C function Wafer finish Time Date string const char fmtStr Time Date format like Job Yod YY YoHYo for strftime standard M S C function kdx_get_start_wafer_ time_str Returns string const char kdx get wafer finish representation for time str wafer finish Time Date Kalos 2 User Manual 393 5 KITE Utilities Returns string const char Device start Time Date stri kdx get start device representation for a isl time str device start Time const char fmtStr Time Date format like Date b_ d_ Y_ H for strftime standard M S C function Device finish Time Date string const char fmiStr Time Date format like Yob Yod YY _ H for strftime standard M S C function Returns current Time kdx get time posetimo oat vod kdx get start lot tim Returns lot start Time eat Wr IE kdx get finish lot ti Returns lot finish Time Date void NEN kdx get start wafer Returns wafer start tne Jimena wr LL Wafer finish Ti kdx get wafer finish Returns wafer finish LLANA Device start Time Date Device finish Time time t Date wid T unsigned Ton Returns elapsed test number meam Returns elapsed tme oem d romreterence time ETET TETT Device Number and Site Information Return
132. test unit used for go nogo parametric testing A synonym for vector mode In the Kalos Test Language KTL a resource is a component of a test program which contains data to be applied to the DUT Reduced instruction set computer An ANSI standard interface for interconnecting computers and peripherals such as terminals device handlers and wafer probers Kalos 2 User Manual 549 A Glossary of Terms S SAC System analog controller SBC Surround by complement Precede and trail a force pulse by its complement within a test cycle SCAN DFT methodology which uses dedicated embedded shift registers shmoo plot A one axis or two axis pass fail plot of a series of measurements corresponding to plot coordinates thus showing the operating region for a device for those parameters shutdown The usually graceful termination of operation system execution on a processor or system of processors sink current active load Conventional current flow into a DUT with the active load as pullup sink voltage active load Terminal voltage at a DUT acting as current sink site A DUT position on a test head with more than one such position site number A number that identifies a site location on the test head skew The effect of different propagation delays between signal origins and device pins or other points for example probes slew rate Rate of change of a voltage or current slice One 48 channel component of a Kalo
133. tester architecture is graphically presented using a tree Each branch of the tree represents a part of the Kalos 2 tester hardware Clicking on an item in the Navigator launches a window that displays the registers of a part of the hardware If such a window is already launched but not visible the navigator does not create a new window it brings the existing window to the top of the window stack To create another instance of a view window hold down the Shift key and click on the node in the tree The Navigator contains several classes of views The class of a view can be distinguished by an icon image in the tree A description of each class and an image were applicable of its icon are provided in the following sections Channel Views c Channel views show channel resources The channels displayed are selected using the channel edit box on the ShowBitz toolbar or by using the Channel Selection Dialog Channel views are interactive and allow users to instantly change the hardware with a point and click approach Omni Views Fa Omni views show registers in the Omni ASIC that are not channel related The Omni selector on the ShowBitz toolbar selects which Omni ASIC is displayed If ALL is selected each Omni ASIC in the current slice mode is read back and compared If values differ from one ASIC to another the value is shown with a red background Omni views are interactive and allow users to instantly change the hardware with a point
134. that are available 3 Current information of the dll loaded 4 Selected dll Filename Clicking on a filename in the ListBox 2 selects that dil program for the Load operation Three step process 4 5 and 6 PA After loading the tester goes into automatic mode Once the driver is loaded and you are ready to start testing click on the Start button In Single Site testing you will not need to choose the Site Mapping File SMF The SMF maps the DUTs to slices Kalos 2 User Manual 125 4 Introduction to KITE Kalos 2 Integrated Test Environment If you are in AutoTest Mode and you press the Stop button a dialog box appears confirming the stop auto test action Tests on the wafer continue to execute until you select Yes or No from the dialog box If you choose Yes the current test will complete execution for that die and bin out If you choose No it acts as a cancel and testing continues NOTE If you are in manual mode and you press the Stop button the test stops immediately The DevicelF Information area displays the type of interface and characteristics of the interface such as the Device Type Device Mode the Diameter of the Wafer and temperature you are testing at To update the prober mask click on the Update to dll button under the Prober Mask area The Readbacks area specifies the data structure from the selected dll NorE The Pause button when depressed completes the current test an
135. that labels the value and the actual data value In general the number labels and types of data items are the same for all markers of the same type Markers are transferred from the tester to the Waveform tool and read from and written to awav files The only way to define or modify markers is to edit a awav file by editing the markers according to the syntax described in the Marker Syntax section While no constraints are placed on markers the Waveform tool recognizes some specific marker types and displays them in a predefined way Markers that are not recognized by the Waveform tool are drawn as generic markers Marker Types There are several types of markers Title Marker e Cycle Marker e Cycle Count Marker e Vector Marker Scan Marker Elapsed Time Marker e Cycle Set Marker Time Set Marker Compare Marker Results Marker e Generic Marker Pulse 248 PN 071 0359 02 October 2005 Waveform AWT e Generic Marker Figure 152 Markers es drid bardo Proc t3 DSL To control which markers display and which do not 1 Choose the menu item View gt Markers 2 A checkbox list of all marker types that currently exist are shown in the Marker Display Selection dialog Select and or deselect marker type checkboxes based on what to display in the waveform graphic pane area 3 Click OK Also refer to Marker Control in CMD Files Marker Syntax In AWAV Files Title Marker The title text appears cen
136. the programmed value at the midpoint 10 Stop Value shows the Stopping value the shmoo stops at determined by the index and number of steps with the programmed value at the midpoint 11 Index Shmoo generated setup is based on the default Index value however the user may change the value by selecting one of the predefined values in this field 12 Steps Shmoo generated setup is based on the default Steps value however the user may change the value by selecting one of the predefined values in this field 13 Reset button returns the Index and Steps field tables to the default values NorE Index and steps can be changed Levels Window The Levels window provides a view only window that displays the levels set in any Level Table contained in the KTL program The user may select a Level Table for viewing or allow the application to automatically select the Level Table used by the test on which the breaktrap is set See Figure 280 for the layout of the Levels window 498 PN 071 0359 02 October 2005 Pin Monitor Figure 280 Levels Window 5 I i0 33 424M 7 hom Following is the description of each field of the Levels window 1 Break Test button switches between Break Test and Level Table When Break Test is selected Pin Monitor retrieves the KTL programmed Level Table from the test program If Level Table is selected manually select the Level Table BreakT
137. the selection list of available resources e Check box Checked unchecked enable disable corresponding condition Kalos 2 User Manual 85 3 Test Program Definition Edit box Specify the value of the selected resource to match during the test to generate arm trigger events e Save Settings Save the current settings Get Settings Restore the previous settings Reset Reset to Kalos software defaults select SOF and STV cycles before arm amp trigger set to 0 cycles after arm amp trigger set to 1 arm first instruction selected arm URAM address 0 selected Apply Apply current settings to active targets Close Close the History Ram Control application After setting arm trigger conditions and storage modes perform a pattern burst by clicking the Run PG button on the debug section of the toolbar see Figure 52 Figure 52 Run PG Button wo Kedit setLoopCounters kpl x E File Edi View Compile Tools Options Window Help x AAA TABA T CH Jad 77 Ls setLoopCounter kpl Created by Long Tran R n PG verify kedit Purpose demo the use of various PG RUN to execute a pattern Expected results 1 content of loop counter vill depend on argument of PG RUN xv import common48 ktl PG PATTERN edgesets0 INIT t i loop 0 O loop 1 O loop 2 O loop 3 O After the pattern burst datalog results captured under the specified storage condit
138. tool icons perform bookmarking functions that allow for quicker movement within the editing environment and flagging of syntax Kalos 2 User Manual 65 3 Test Program Definition Anonymous Macros Macros provide a shortcut to typing a sequence of commands that are applied repeatedly to a body of text One use is inserting a space at the beginning of each line Debug Tools These tool icons perform debug operations such as setting or clearing breakpoints and controlling the flow of execution through the test program Refer to the Debugging Using Kedit section of this chapter for additional information and details on using this tool Tool Functions The following is a functional description of each tool icon on the toolbar Standard Tools New Allows the user to create new files of which the type must be specified N Open Workspace Brings up a pop up window which allows the user to select a file to open as a workspace Open Allows the user to open a file to be used with Kedit Save Saves the changes made on a workspace or Kedit Cut Cuts the highlighted section of a file Copy Allows the user to select and copy part of a file gt CO o a Paste Allows the user to paste the copied part of a file to another part of the file or a different file eo Find in Files Search engine to find files etc 9 Print Allows the user to print the file 10 Compile File Recompiles only the file in the curr
139. 0359 02 October 2005 Running System Diagnostics Running System Diagnostics System diagnostics is launched by clicking on the Cal Diag icon on the Front Panel toolbar see Figure 116 or by selecting CAL DIAG from the Utilities pulldown menu Figure 116 Front Panel Toolbar Single click to open the Calibration Diagnostics window Cla SH E HE O EFE we Calibration and diagnostics software programs are located under the File menu inside the Calibration Diagnostics window see Figure 117 Figure 117 Calibration and Diagnostic Programs Sta n d a rd Calibration Diagnostics ih kchk 1 elk Sa la tle Edt Yew Options Execute Window Heb e x an P on Quo F Calibration 7 P M m Clear Registry prog rams Print Pai O EO 1 y g UH Pin Preview ph hb E 1 GUSERS Releaselih kehk 2 CUSERS Releaselih kcal Diagnostic Program kchk dia The kchk dia program is used to verify the system hardware Invoke this diagnostic program by selectingC Kalos bin kchk dia from the File menu in the Calibration Diagnostics window The program appears as shown in Figure 118 Kalos 2 User Manual 187 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 118 Calibration Diagnostics Programs Options Dialog window selection Calibration Diagnostics ib Kchk bin files E hannel Slice a Datalog Summary Summary Summary NUERA ES TIO VAN
140. 05 Figure 110 ShowBitz Breaktrap Settings Pause_Step ShowBitz PG Burst Eie view Help jv File Bar Y Status Bar si P Send Bar Record Bar Selections Bar m Navigator Bar Y PG Burst Bar v Emsa Loading C XKALOS B2 2 2 CD BIN etdc960 out on slice A00 Loading C KALOS B2 2 2 CDXBINYelc960 0ut on slice A00 Loading C XKALOS B2 2 2 CDXABINAsbiz out on slice A00 Ready 8 amp nweBu su eosest PG Burst EJE Start at Uram o T Loop T History Ram Setup Mode Store All z Stop Dly Cycle 000000006 ez mia F Fails only stv Only CI Pass Fail Results Fail E Pass T of 0 I of 0 Options History Ram EH Omni Views B uram B Eset view Eg p la Error Logic E TG PassFail View E TG vector PassFail view E PG HistoryRam o TG HistoryRam Arm Trig HistoryRam B Do RAM B oc Ram CJ virtual Pin Ram B virtual Pin Rams E Omni Registers ANC C Boundary FlipFlop E cal m Cd Communication Ram Y In ShowBitz click on Omni Views gt Eset view and then on Level Sets This launches Eset View channels windows see Figure 111 These windows display the timing and level sets applied to all channels pingroups specified in the channel slices when the Read_CKBD_all pattern is loaded Now only the Timing and Levels settings applied to ADDRESS DBUS and CECONTROL pingroups are displayed The user
141. 100 Base TX Ethernet is used to communicate with the 72 ETX controllers in the Kalos 2 test head The complex system management support requirements imposed on floor operators by a workstation environment are avoided by use of standard Windows based operator interface A 2 4 GHz cycle rate Intel processor provides computing and a monitor display offers responsive operator control for viewing test results See Figure 2 Figure 2 Tester Set Up Monitor Ac input Boards 00 08 Boards 09 17 O Switch w U N w v W Ts IT I MIC EN 22 8 spieog S 87 spieog NoTE Optionally an additional PC can be added as the data server of Kalos 2 systems PN 071 0359 02 October 2005 Kalos 2 Test Head Kalos 2 Test Head This section describes the Kalos 2 test head Information on I O pin configuration backplane and wiring test head opening mechanism cooling DUT and interface are discussed I O Pin Configuration The Kalos 2 test head consists of four backplane boards and 36 Kalos 2 96 pin main boards Each side of the Kalos 2 test head consists of 2 backplane boards and 18 Kalos 2 96 pin main boards Each backplane board connects to nine
142. 1009 Therefore it is incorrect to have the following test in the test flow start with number 1001 because these values are overwritten by the C Hook measurements of the test trimming which is test number 1000 Custom DLL Creation This section provides information on how to create and implement custom DLLs Custom DLL Structure Users can add custom DLLs to the DE These DLLs must have a specific structure of exported functions in order to be correctly loaded and initialized by DE A number of functions exported by main EXE can also be called DE custom DLLs are event driven Although DLLs for both Data Engine and Dlog Engine may have the exact same functionality they are NOT interchangeable The DLLs created for Data Engine must be recompiled with dlog engine lib before using with Dlog Engine Required Elements for Custom DLL Creation The following elements are required for custom DLL creation data engine lib or dlog engine lib are located in KALOS_HOME lib 380 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine e dlogex types h data engine if h and kdx if h kdx tpe dlog h along with other standard Kalos include files are located in KALOS HOME include Microsoft Visual C 6 NOTE This manual describes the creation of custom DLL with Microsoft Visual C 6 Usage of other compilers is not tested Custom DLL API Standard Functions DE custom DLLs include the following exported functions kdx ret
143. 102 97 79 369 34 75 01P Hard 1 98 115 121 80 451 42 413 02F Hard 2 13 17 10 15 55 5 19 03F Hard 3 17 22 21 18 78 7 32 04F Hard 4 23 39 29 22 109 10 28 End The files in project which do not require manual changes are not listed kalos_production ini 404 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine DATA ENGINE USER2 DLL Swafer summary dll wafer summary ENABLED true Can be True False 1 0 FILENAME machine id lotname flow_id time WAFER_ FILENAME machine_id Ylotname flow_id Yowafer num INT02 time FILE EXTENSION wsm TEST_SITE CREDENCE_US wafer_summary def LIBRARY wafer summary DESCRIPTION wafer summary Windows Dynamic Link Library EXPORTS Explicit exports can go here kdx register callbacks kdx shutdown wafer summary report wafer summary cpp include stdafx h include wafer summary h Include DE header files include lt kdx_1f h gt ifdef_ DEBUG define new DEBUG_NEW undef THIS FILE static char THIS FILE FILE 5 endif IHE TTE TT TI CWafer summaryApp BEGIN MESSAGE MAP CWafer summaryApp CWinApp AFX_MSG_ MAP CWafer summaryApp Kalos 2 User Manual 405 5 KITE Utilities NOTE the ClassWizard will add and remove mapping macros here DO NOT EDIT what you see in these blocks of generated code IY AFX MSG MAP END MESSAGE MAP WIRT CWafer summaryApp construction CW
144. 2 Service Manual Part Number 071 0454 xx Personal Kalos 2 PK2 Site Preparation Guide Part Number 071 0336 xx Kalos 2 Site Preparation Guide Part Number 071 0379 xx PK2 Unpacking and Installation Manual Part Number 07 1 0477 xx Kalos 2 Unpacking and Installation Manual Part Number 071 0479 xx Related Manuals Microsoft Manuals MS Manuals IEEE Kalos 2 User Manual xxvii About This Manual Online Help Documentation The Kalos 2 documentation set is a collection of Credence manuals and technical documents which have been prepared for online viewing using Adobe Acrobat Reader To view the documentation Adobe Acrobat Reader with Search must be installed on the computer The 32 bit version of Reader with Search for Windows is included on the Kalos 2 CD To install it locate the file named rs405eng exe and double click on its icon Installation instructions can also be found in the Readme txt file located on the Kalos 2 CD Follow the instructions provided by the Adobe installation wizard to complete the task To access Kalos 2 documentation insert the CD into the CD ROM drive of the computer If the KITE software installation contained on the CD was run previously the documentation is already loaded into the Kalos2 doc directory The documentation can be accessed by selecting the Help Menu on Kedit application or by double clicking on KITE Reference Manual pdf or User Manual pdf files located in the Kalos doc directory
145. 3 12 2003 11 22 AM ND Gre 11 11 2002 11 54 AM 148 opt Serpe File 11 7 2002 11 00 AM D LE shared on Fromont VCS Cluster cater fremo Control Panel 4 V My Network Places Recycle bin Start Menu pl 3a Kalos Configuration M 4p Re TECH PUBS RELE Z Adobe FrameMaker 2 UserManl Jasc Paint Shop Pro Control Menu The control menu is opened by selecting left mouse the control menu box in the upper left corner of the application window on the title bar for the application or file see Figure 22 When an application is minimized this menu can be accessed by right clicking on the application icon in the Window s Start menu bar The control menu box provides a drop down menu containing the following options Kalos 2 User Manual 29 2 User Operations Restore The Restore option returns the application window to its former size after the window is enlarged maximized or reduced minimized Move This option allows the application window to be moved to another position by using the keyboard Size This allows the application window to be resized using the keyboard Minimize Minimize reduces the application to an icon on the Start menu bar Maximize The Maximize control switches the size of the window between its former and maximum size When the window is not in its maximum size the height and width of its borders can be changed by clicking on the outside edge of the window until the cursor changes to
146. 32 PN 071 0359 02 October 2005 Bitmap Setups The Setups area of the Bitmap Application property page shown in Figure 309 provides for scan editing functions The test variables setups are the same as defined by the Kalos 2 Shmoo and Value Log tools This allows the setups to be interchangeable between the tools Editing functions that define variable setups 1 D shmoos use only one setup are performed here A spreadsheet containing data fields for user input of values that define the variable setups used with the scan function of the Bitmap Application is shown in Figure 309 Figure 309 Scan Setups Property Page Scan setup area CEB Bm Display Socket amp Setups Fail Table Overviews 2 BIM Viewer 10 SCRM Data RBK io panga E o IOYw Blocked Arrays Foley Socket Fite Width Addresses Outputs Steering Rows Columns amp lOs Definitions EdgeSet No_EDGESET_Table Setup Edit Add Element Element Edit aa Soc Pin Definitions Assignment Type Name Start Index Stop Steps Normal OpUECE Channel Normal OpUECE os J s__ lo lo 100 100 Low Limit High Limit 10 10 101 101 os os njajo 10 10 102 102 10 10 E 103 HO EdgeSet 10 lo 4 PiniPin Group Symbol Type EdgeSet Index Resource Start Index Stop 2 ma 1 Pnos TIM 0 Ti EDGE Os 0s Ds o io 07 2 Pn04 TM 0 T1 EDG
147. 4 A15 A16 A17 A18 A19 A20 PINGROUP DQ0 DQ1 DQ2 DQ3 DQ4 DAS DQ6 DQ7 DQ8 DQ9 D910 D011 D012 D013 D014 D015 PINGROUP Dataminus567 DQ0 DQ1 DQ2 DQ3 DQ4 DQ8 DQ9 D010 DQ11 D012 D013 D014 D015 PINGROUP Dataminus7 DQ0 DQ1 D02 D03 D04 DQ5 DQ6 D08 D09 D010 DQ11 D012 D013 D014 DQ15 PINGROUP CONTROL CE_0 CE_1 0E_ WE_ PINGROUP INPUTS ADDRESS CONTROL PINGROUP CECONTROL CE O CE 1 PINGROUP ADDMINUSG 40 41 42 43 44 45 47 8 19 110 411 412 413 14 15 A16 A17 18 419 420 Compiler Output Find in Files For Help press F1 ln214 Coll Not connected NUM A An example of the interrelationship between the pingroups and the socket table is shown in Figure 30 48 PN 071 0359 02 October 2005 Figure 30 Test Program File Pingroups and Socket Table Interrelationship Pingroup statement for allpins a PINGROUP allpins address_pins Gate poney Pingroup statement for address_pins control_pins PINGROUP address_pins Socket table statement for defining AO A0 A1 A2 A3 A4 A5 A6 A7 y y SOCKET single DP1 A0 ADDR PIN X10 9 DP2 Al ADDR PIN X11 10 DC Tests Parametric Tests contain and point to data that is used to perform actions and measurements on a device under test DUT Figure 31 shows basic DC test examples This includes
148. 42 DPS 443 flow 433 level table 440 levels 439 441 Scan Setups Bitmap 533 Setups shmoo 468 Socket 429 summary application 134 test debugger 423 428 431 test elements 438 timings 442 property pages Front Panel 116 PSET 549 PTC 549 PTU 549 Pulse parameters 269 pulse waveforms 232 Push button 256 Push2 button 256 PVM 549 read in filetypes 219 real rectangular waveforms 279 recalling a waveform 280 region zooming to 236 removing a cursor 236 resource 549 resource icons 63 results marker 252 RISC 549 Rotate Down button 256 Rotate Up button 256 RS 232C 549 SAC 550 safety information xxx safety statements xxxi safety ESD xxxiv safety operators xxxii safety service xxxiii sample mode drawing style 223 sample rate 241 samples changing the number of 240 save as filetypes 219 saving a waveform 280 sawtooth waveforms 231 SBC 550 scale fit to window 247 X 242 Y 243 SCAN 550 scan marker 250 script files executing 285 scripts 562 PN 071 0359 02 October 2005 creating 281 scroll synchronize 224 scrolling X 246 Y 245 Segment button 256 select test 434 selects property page shmoo plot 459 SEQUENCE IF 436 INC FBIN 436 ON 436 SET BIN 437 SYNC CYCLE 437 sequence property page 438 sequence test debugger 424 service safety xxxiii set track cursor 237 SET pins dps state 437 setting dimensions shmoo 461 setting up s
149. 44 errors and warnings monitoring 283 ESD safety xxxiv Ethernet connection 7 ETX CPU module 17 18 EVENT MAP statement 56 executing script files 285 exiting the Analog Wavetool 298 558 PN 071 0359 02 October 2005 FBins functional bins 126 file locations 227 file name 544 file organization 43 file structure 26 filetypes read in 219 save as 219 filetypes of waveforms 219 Filter parameters 274 fit to window 247 FLASH 544 flow diagram 433 flow level 43 flow property page 432 bin table 431 432 graphical 434 test debugger 431 flow statement 52 flow table 432 flow table flow property page 433 flow tables test debugger 423 fly by tool tips 61 folder 34 force 544 format 545 FrntPanel icon 108 Front Panel 108 main window 116 menu bar 110 property pages 116 Shmoo tool 453 toolbar 114 208 FSET 545 functional bins FBins 126 functional preconditioning 545 functional test 51 545 functions Front Panel 108 Gaussian Noise waveforms 232 generic marker 253 go no go test 545 GPIB 545 grabbing a cursor 237 graph pie in summary 135 graphic area shmoo 458 graphical flow property page 433 graticule color 224 graticule types 223 Index guard band 545 GUI 545 KITE 110 handler 200 hardware configuration 17 header information 38 header shmoo 456 help online 57 Hex system 545 hexadecimal notation 545 histogram drawing style 223 his
150. 5 Resource Fly By Tool Tips Cont Resource Template Keyword FLOW test name pass branch fail branch BINTABLE bin name bin no soft no PASS FAIL SOCKET DP name type assign channel To open a Workspace select File gt Open Workspace and a browser menu appears that allows you to select the test program you wish to edit or modify as well as its associated files A new Workspace can be created from an existing Workspace by opening the file and renaming it This is accomplished by selecting File gt Save As and a browser menu appears Enter the name of the new file and select Save To create a new Workspace click the left mouse button on View and ensure Workspace is selected Then from the File menu select New and a window appears from which you can elect to create a new file KPL KTL KPJ C or Other Resource Icons The resource icons see Figure 37 allow you to go to the location in the test program of specific resources by clicking on the item with the left mouse button It initially shows the keywords for resources in the test program and works much like the Windows Explorer NOTE This feature is activated only for test programs opened as a workspace When the positive symbol to the left of the name of the resource you wish to view is clicked a list of the items that make up that resource can be viewed For example Clicking on the positive symbol next to CYCLE TABLE lists the
151. 57 Figure 258 Figure 259 Figure 260 Figure 261 Figure 262 Test Bugger ICON 2 ieu ies nad xao AA 420 Compile Option Settings llle 421 Test Debugger Primary Main Window 422 Overview Primary Window llle 426 Toolbar ICONS D Aa 427 Overview Property Page aaa 429 Socket Property Page Table 00 0a 430 Socket Property Page Package 431 Flow Property Page Bin Table 432 Flow Property Page Flow Table 433 Flow Property Page Flow Diagram 434 Test Property Page Test Blocks 435 Test Property Page Test Elements 438 Sequence Property Page cece eee eee eee 439 Levels Property Page Level Table 440 Levels Property Page Pin Group 2045 441 Timings Property Page Timings EdgeSet 442 Timings Property Page Waveforms 443 DPS PMU Property Page DPS Setups Tab 444 DPS PMU Property Page PMU Setups Tab 445 Setups Property Page aaa 446 Cons Vars Property Page a vere sa naa REX KG KWAK eee ed 447 Misc NVM ID s Property Page lt lt lt lt lt lt lt lt lt 449 Misc Patterns Property Page oooooooooooooo 450 Shmoo PMon VLog Tools a 453 Shmoo Primary Window lisse
152. 6 o ADDR URAM Counters o 1 CYC 0x00000001 REF 0x00000000 RPT 0x00000000 FrontPanel Messages History RAM Theory The History Ram is a 64 location memory which stores various Omni central and channel resources including the observed responses of the DUT Serial Pass Fail CntrC 0x Z Y X 0x00 0000 0000 N 0x0000000000 N E3 Ie Ram Control Save Settings Cycles Storage Mode Before Arm amp Trig 0 V STV After Arm amp Trig ho iv SOF Arm Condition Lm M m 4 i Ea Settings Other Settings lv Arm First Instruction Trigger on Fail Trigger First Instruction Trigger Condition The memory wraps around when the maximum storage is exceeded When the store this vector and store on fail storage modes are not enabled the History Ram stores data on every cycle until an arm and trigger condition is met then stops after the selected number of cycles in stop cycle counter or the Patgen stops Various conditions can be set to arm and trigger the stop cycle counter An arm event can 160 PN 071 0359 02 October 2005 History RAM Control occur at the same time as a trigger event or prior to it Once armed a trigger event causes the stop cycle counter to count down from its preset value Upon reaching the terminal count the stop cycle counter inhibits further storage The stop cycle counter value can be se
153. 99 x X kk kk kk KKK kk kk kk k kk kk k kk kk kk kk kx 7111888999 X k kk kk k kk kk kk k kk kk kk k kk kk kk kx x kx x LIT QN RK RK KK KKK Kk KK Ck Ck KK KK KKK KK KK KKK 66 L1 1 1 kk kk kk kk KK KKK KK KKK KK KK KK KK KK 4 000 V 555566606 kk KKK KK KKK kk KK KKK kk KK KKK KK KK KK KK 55555566 X kk k kk kk kk k kk kk kk k kk k kk kk kk KK KKK 4444555 XX kk KKK kk kk kk k kk kk KKK KK KK KK KK 444555555 X kk kk kk kk kk k kk kk KKK kk KK KKK 34335555 X kk kk KKK KK kk kk kk k kk kk kk kk xk 3 000 V Z2ZZBG4AGRKKKKKKKKKKK KKK KKK KKK KK KK KKK KKK 1121333 X kkkkk KK KKK KK KK KK KKK KK KK 11222202 kk kk kk kk kk kk kk kk kk 111111127 w x X XkXkXkXkkkkkkkkkkk k Xk OO01111 f w XkXkXkXk kk k KK kk KK KK 2 000 V 000111111122222222 x x Kalos 2 User Manual 483 7 Shmoo and Bitmap Tools PMU XY Plots Figure 270 PMU XY Plot Program filename Ser 1 Lot 1 Date mon day year time Comment user statement Level tablename Time tablename Pattern sequencernam Options X Axis VariableName Start 1 500uA Index 0 200uA Steps 50 Stop 1 000uA Y Axis VariableName Start 5 500 V Index 0 100 V Steps 20 Stop 4 500 V 5 500 V 5 000 V M PPMU Plots Figure 271 PPMU XY Plot Leakage Program filename Ser 1 Lot 1 Date mon day year time Comment user statement Level tablename Time tablename Pattern sequencernam Options X Axis VariableName S
154. A 000000006 TIM FMT y Messages Ready AE EEE Various test suites are listed on the left side of the window as shown in Figure 119 Each suite contains several tests that can be viewed by clicking on the box to the left of each test suite s folder button NOTE Warm up the tester before running diagnostics Failure to do so can cause test results that are too close to the edge of pass fail ranges 188 PN 071 0359 02 October 2005 Running System Diagnostics Figure 119 Test Suites Los A sx E Dakung 5 po Click here to expand test suite Note Expanding is a view only function Messages Testing CiVUSERSV romoVk2 41503 Release starte at 17 57 T pm l d alid ab se Fie Sirs To execute a test or test suite click on the folder icon To execute the entire diagnostic sequence click on the folder icon next to the program name see Figure 120 Figure 120 Test Suite Execution Click here to execute the entire diagnostic sequence HF Note Some test suites have several levels of tests 0000000 TIM_FMT Kalos 2 User Manual 189 4 Introduction to KITE Kalos 2 Integrated Test Environment Diagnostic Windows The Diagnostic program is divided into four windows as shown in Figure 121 The test suites in icon form are displayed in the window on the left Individual test names as th
155. A RARA R RU A AA AK A AG AGA EEEE EEE CONFIG chkrbd w DGSET InputLeakageHigh OutputLeakageLow OutputLeakageHigh Isb CMOS Test Isb TTL Test ICC Test Chip Erase verify Array read ff wrt rdCKBDO alu wrt rdCKBDf alu wrt rdCKBD55 import wrt rd subroutine polling d7 bof wrt rdSTRIPES mask ecr example Bini CONFIG Training Test Flowl Training Test Flow Training Test Flow3 Training Test ECR Example Bin8 Bin8 Bin8 Bin8 Bin9 Bin22 Bin23 Bin23 Bini0 Bini3 Bin25 Bini6 Bin24 Bin24 BiniS Bin19 LF RAAARAAAA EAA RRA RAR RARA AAR A AAA A AA AERA RRA RAR RARA Ww class program ktl ojx For Help press F1 Ln 1386 Col6 Not connected 1 When defining a TEST resource the SEQUENCE keyword followed by and brings up a menu of the following resource types PMUTEST PATTERN LEVELS DPSSET CYCLE TABLE SEQUENCE VLOG CHOOK EDGESET Kalos 2 User Manual 73 3 Test Program Definition Select one of these resource types with a single mouse click or the Enter key A list box of names with that resource type is then displayed Use the Enter key or double click the mouse to add the selected resource symbol to the test sequence When a comma is entered the list of resource types is displayed again Debugging Using Kedit Debugging operations are available when using the Kedit utility as shown in Figure 42 The Debug tool icons per
156. AM and EMU controller End of lot End of test End of wafer A discrepancy between an expected value and a measured value The collection of a specified group of functional vectors upon detection of a functional error Part of the identification used to locate a file on a volume A high density EEPROM To stimulate DUT pins with formatted pattern data 544 PN 071 0359 02 October 2005 format FSET functional preconditioning functional test go no go test GPIB guard band GUI Hex system hexadecimal notation To produce a waveform from pattern data and timing information in accordance with a format mode Format set referring to driver formats Setting a logic device for example a counter to a desired state by applying stimulus sequencing through functional test vectors and checking output until the desired state is reached Also called match mode or loop until pass A process that applies pattern vectors to a device and checks the output to determine that the device is operating according to its truth table A test with minimum and maximum limits that stops on the first error without performing any diagnostics characterization or actual measurements other than limit checking General purpose interface bus Defined by ANSI IEEE 488 1978 1 Device testing Adjustment made to a DUT s test specification to take into account test system accuracy repeatability reproducibility a
157. ARI AN AREE 7 cda EKRA E cmt E PG HistoryRam 0 0nS DL 0 0nS DL 0 0ns DL D 0nS DL E TG Historynam 19 0 0nS DL i 0 0ns DL i 0 0ns DL 0 0nS DL B Arm Trig HistoryRam DGO RAM Show Tset Fset for URAM address fo ij Tset fo Feet 0 Period 20 0005 DG1 RAM Virtual Pin Ram B Virtual Pin Rams E a Omni Registers ANC Boundary FlipFlop 1 3 cal Loading C KALOS B2 2 2 CD BIN etdc960 out on slice A00 CJ Communication Ram Y Loading C KALOS B2 2 2 CDXBINYe10960 0ut on slice A00 Loading C KALOS B2 2 2 CD BIN sbhiz out on slice A00 0 0nS DL ET 180 PN 071 0359 02 October 2005 Idrom Property Page Idrom Property Page Each Kalos board contains five serial electrically erasable non volatile memories Motherboard PMU DPS EMV modules and ETX Each is called an IDROM IDROM is an NVM memory chip which stores module information on each Kalos board module This information includes part number revision number ECO level etc In addition each backplane in the test head contains an IDROM Each IDROM contains formatted data identifying the manufacturer of the hardware and its capabilities This information is programmed into the IDROM during the manufacture of the hardware Each time the Kalos 2 test system is initialized the IDROM data is retrieved and made available to all Kalos 2 boards and XP software This information is used by Kalos 2 software to determine how to best utilize the hardware The Idrom uti
158. Area Conventional Symbols The following table shows the conventional symbols by default colors used in the waveform area 310 PN 071 0359 02 October 2005 Logic Debug Tool Table 27 Conventional symbols used in the waveform area of the LATool window Symbol Indicates No Fail Fail green red Expect Hi y green y red Expect Low Y green X red Expect Midband t green red Expect Valid O green lt gt red Open Window pama blue red Programmed level Waka blue gt red Programmed don t care or undefined level black red Actual measured level es black Level not measured yet es green green Base line Additional Information The rows at the bottom of the waveform area show the values of the following three variables at the beginning of each cycle e Time nS time in terms of nS TSet the number of the used timing set e Cycle the cycle number In addition to it the following values are shown in the lower left corner of the window Kalos 2 User Manual 311 5 KITE Utilities e Sample n m where n is the number of the samples already obtained during the ongoing measurements and m is the number of the samples to be obtained within the cycles of maximum duration i e the number of the samples actually obtained within the shorter cycles will be less
159. CYCLE TABLESs in the program Double click on the desired entry to view and or edit that location in the program When a resource is selected a minus symbol appears to the left replacing the positive symbol If you no longer wish to view the individual entries click on the minus symbol to close the list of files Double click on the desired entry to view and or edit the file in that location These functions allow for quick and convenient test program navigation The blue arrow pointing to the left on the toolbar allows you to go one selection back Kalos 2 User Manual 63 3 Test Program Definition Figure 37 Resource Icons x Kedit Intel16M E9 File Edit View Compile Tools Options Window Help Dns oe eS 8Bu Gun p i olx Resource o3 Intell6M ktl header E SOCKET Mu CYCLE NAMES Resource Eh CMODULE f PINGROUP Fh CONSTANT f VARIABLE DPSSET 23 PMUTEST Bu LEVELS b TSET TABLE Hu FSET TABLE f PSET TABLE b CYCLE TABLE f TIMING 20 LOADDBM Eh SEQUENCE Bu TEST E FLOW Hu EVENT MAP Mi BINTABLE f CONFIG f EDGESET BLK E RA SETUP f SEGMENT TABLE f DOMAIN TABLE f EDGESET Navigation and Edit Tools w Kedit K2 demo EJ File Edit View Compile Tools Options Window DmuE EM 6 he je m uu gt 3 amp Bi xi K2 demo ktl 2 3 C Files system time c usr_input c history_ram c flag reg c cram c pnu bump c KPL Files shno
160. Control Store All Mode All cycles are stored if neither STV or SOF modes are chosen in the History Ram Control window During each tester cycle all of the PG TG data for cycles is stored up until an arm and trigger occur followed by the number of cycles in the Before Arm amp Trig field In this mode a complete window of execution can be reconstructed around the trigger cycle Arm The arm condition allows users to identify a condition that must occur before the History RAM can trigger After the arm condition is set the history RAM stores data until the trigger condition is met The advantage of having a separate arm capability is to delay the triggering to a URAM or cycle that occurs later during the burst possibly after many other fails have occurred NOTE Arming on the first cycle and triggering on the first fail is the Kalos 2 default The following are conditions that can be used to arm as well as trigger an event e A fail occurs AURAM address is executed Any counter reaches a condition value e Any combination of the above logical AND combination As shown in Figure 105 users can choose one or more conditions which must be met to set an arm condition Kalos 2 User Manual 165 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 105 Setting Arm Conditions 1 Choose the condition to arm the device History Ram Control Storage Mode Other Settings M STY Cycles Before Arm
161. D Read all ff ECR test name Opens Shorts Erase array Read all ff Write AMA all Read AAAA all Read all ff ECR 2 pass branch Shorts Erase array Read all ff Write CKBD Read CKBD Read all ff ECR Bini 4 pass_branch Shorts Erase_array Read all ff Write AAAA all Read AAAA all Read all ff ECR 2 Bini uaa a 4 RR GG A 4 ARERR AR RERE AAA EREE ERA RERERERREEEE fail branch Bin2 Bin8 Bin10 Binili Bin20 Bin21 Bin25 fail branch Binz Bing Bini0 Binili Bin22 Bin23 Bin25 Ln 3327 Coli Not connected NUM A 58 PN 071 0359 02 October 2005 Kedit Kedit The Kedit utility is a Kalos 2 supplied text editor Kedit is used to generate edit compile and debug test programs Launching Kedit Kedit can be launched by clicking on the KTL icon located on the toolbar of Front Panel see Figure 35 or by selecting Utilities gt KEDIT from the menu bar Kedit can also be launched from the Kalos 2 bin directory by double clicking on the Kedit application Figure 35 Kedit Icon Click here to launch Kedit stop K2 80NHz Data Rate NOTE For easy accessibility a Kedit shortcut can be created Program Loading Once the editor is launched click the left mouse button on the file pulldown menu see Figure 36 From this pulldown menu a program can be selected for loading Options include New to create a new file Ope
162. D TSet lt gt 0 o N MN oiojojojoioiojoioiocioioioioioioioinijoio o oioioioioioiooioioioio oio oioioio oilo w oioioioioioio oioioioioio o loioioio oio of 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 00 00 00 0 wo oiojojojojojojoiojoiojojojojolojojojoio en Q iOi O OiOoioioioio o oioio o oio oioioio 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 13 1 2 3 4 5 6 7 8 9 10 11 Ei iP RP RP PR OTA HO bw nw m i5 OioOio io o Oo O oO0 o o oO O O O oO oO oO o o oO oz ovo aiminiaimiripimimiaininiprinimipibinipip NAnininininininininininin mininin nininik OB 0 010 0 0 0 0 0 010 0 01010j01010010 e PRA pop o pa op pl ip ip ip lp pl ips RR RP RB RP A KR RP BP a BR RB ROR RB RB RB RB RR oioioioloiojoloioioioloiojoioloioiololo D4 Edd LD EDA Da EDC DG EDGE DG ipd Ede ipd Edd ipd Edd Dd iD ibe dd ibd WMiripimMiririOirPimipipirpioipivgioiairnioi oioioioioioio oio oioioioioioioioio oio oioioio oio oio oioio o ioo o oio oioio oioioioloiojoloiolo oloioloiojoioiolo o CD DD DDD DD DD Did oio oioioioio oioiojojioijoioioioioiojoiojojoioioioioio c00000000000000000000 ojojo jo o jo o jo o o o o io o o o io o loo ojolojololojolo lolo jo lolo lolo olololo jo o o o0 o o0 o0 00 0 0 00 0 00 00 0 0 0o0 O ojojojojojo ojojojojojojojojojojojojloja oioioioioioio oiooioioioioio lo 00 00 oioioioioioioioioioiojoioioioioioioioio oj o o o o o ojo o o o o o oio oio ooo ojojojojojojojojojojojojojojojojoj
163. E Clicking the left mouse button in the title area enables direct window movement Clicking the right mouse button launches the application control button dialog window 3 Icon button Minimizes the application window and shuts down all associated windows Maximize button Enlarges the application window to its maximum allowed width and height 5 Close button Closes the Test Debugger Application GUI Menu bar Interface for selecting the operations of the application File Pulldown menu includes SaveAs Saves the current debugging binary file kbi to a specified ktl file Print tbugger ktl Prints a hardcopy of the currently selected ktl program Exit Closes the Test Debugger Application tool and all associated windows Utilities pulldown menu Launches the selected utility application Tools Pulldown menu Launches the selected tool application Help About TBugger Displays the current revision information Kalos 2 User Manual 425 6 Test Debugger 7 Toolbar icons Consist of three graphical buttons Save As Print tbugger ktl and About that when clicked send save and print commands as do menus and keyboard accelerators for requested functions of the Test Debugger utility The Help button displays software version information see Figure 228 8 Program Flow and Action Displays the current test program flow the system is operating under and Breaktrap conditi
164. E FILENAME in DE Global Settings SITE 255 SUMMARIES True Can be True False 1 0 Some STDF readers automatically generate a site 255 When this is the case setting this variable to O or False turns off the generation of site 255 LOG PASS TRUE Can be True False 1 0 STDF option to log results for passed tests If this setting is O FALSE results for passed tests are not logged LOG FAIL True Can be True False 1 0 STDF option to log results for failed tests If this setting is O FALSE results for failed tests are not be logged LOG PARA True Can be True False 1 0 STDF option to log parametric results If this setting is O FALSE parametric results are not logged LOG FUNC True Can be True False 1 0 STDF option to log functional results If this setting is 0 FALSE functional results are not logged LOG DTR True Can be True False 1 0 STDF option to log DTR Datalog Text Records records Refer to Storing ASCII Strings in STDF File If this setting is O FALSE functional results are not logged Kalos 2 User Manual 369 5 KITE Utilities SAMPLE RATE 5 STDF option to collect data on a sampling basis For example if the SAMPLE RATE is set to 5 data for every fifth device is collected SAMPLE LIMIT 100 STDF option to limit the data collection to n devices For example if SAMPLE LIMIT is set to 100 data is collected for a maximum of 100 devices on each w
165. E Utilities STDF4 DLL kdx_stdf4 dll Location and filename of the standard STDF DLL The default directory is 9oKDX DLL DIR also specified in the kalos production ini file The represents the default for this field which in this case is KDX_DLL_DIR ASCII DLL 6KDX DLL DIR9 6Wdx ascii dll Location and filename of the ASCII Datalog dll WAFERMAP DLL Wdx waferMap dll WAFERMAP DLL kdx_Multiwafermap dll Location and filename of the wafermap dll Currently there are two options for wafermap standard wafermap and multi wafermap For a more detailed explanation refer to local override settings below SUMMARY DLL KDX_DLL_DIR kdx_summary dll Location and filename of summary dll SHMOO DLL Wdx shmoo dll Location and filename of shmoo dll USER1 DLL Wdx tpePrintf dll Location and filename of user defined DLL Eight user defined DLLs may run simultaneously They should be specified in keys USER1 DLL to USER8 DLL respectively Local Override Settings for DE DLLs Local override settings are those intended for each data collection DLL Local override settings are used instead of global settings if they are specified in the section of that DLL It is critical that the section name for local overrides is the same as the name of its DLL For example the section name for local overrides is kdx stdf4 This must match exactly the name of the STDF4 DLL in the global settings which is kdx stdf4 dll The d ex
166. E application is the production environment from which Kalos test programs are loaded and executed From Front Panel all other applications tools and utilities can be launched The menu bar and toolbar provide the mechanism for executing these other environments NorE Before re starting KITE once the tester is running ensure that all previous KITE windows are closed then double click on the Front Panel icon Graphical User Interface At start up KITE defaults to the main window of the System Front Panel application shown in Figure 71 This window is subdivided into the following defined operational areas e Menu bar Toolbar Control area e View area Menu Bar The menu bar contains pulldown menu controls that include File View Utilities Tools and Help options The following table describes all areas of the menu bar 110 PN 071 0359 02 October 2005 KITE Software Table 7 Front Panel Menu Bar Description Option Function File Clicking on the File option invokes the following list of selections Operator IF The Operator IF option launches the operator IF Load Project File kpj Load Program File kbi Start GO Test Exit View Pathnames Options Kalos 2 Sort Views PK2 Sort Views window which provides the operators with a one page program loading interface The Load Project File operation is used to load an executable Kalos 2 test project onto the tester hardware
167. E o 0 3 Pnos TIM 0 T EDGE ADDRESS ADDRESS ADDRESS ADDRESS o ceo 4 ES 5 XI mr gos Sis aja mimm tuu JAA ADDRESS ADDRESS 12 X4 ADDRESS ADDRESS 13 x5 X5 ADDRESS ADDRESS 14 X6 ADDRESS ADDRESS 15 XT ADDRESS ADDRESS 16 X8 ADDRESS ADDRESS 17 xa ADDRESS ADDRESS 18 YO ADDRESS ADDRESS 19 Y1 ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS 8 F3 o 8 0 BIN S15 F3 S z E 5 D ta 8 lt E The minimum setup consists of the Axis Printout METE variables These include parameter name start value index value stop value and number of datapoints steps to be executed from the start value Kalos 2 User Manual 533 7 Shmoo and Bitmap Tools Every axis setup has two edit areas axis printout and system resource variables The difference between them is the axis printout is not system related therefore the values are not checked for boundary limits NOTE On input the system checks resource variables against their respective hardware limits New Delete Rename or Clear operations for the selected setup are accomplished by way of the menu bar 5Edit selection or by way of the pop up menu activated by right mouse clicking in the table area Modification of the element row contents is performed by way
168. ES SS o O SRS ee SS s NG s es NS S e Na 2 M S XS S 3 Select the Engineering tab from Front Panel and enter the password 4 Click the BreakMeas button and select the test on which the breaktrap is set see Figure 284 504 PN 071 0359 02 October 2005 Pin Monitor Figure 284 Set Breaktrap 5 Click the Start button of Front Panel to initiate the breaktrap see Figure 285 Kalos 2 User Manual 505 7 Shmoo and Bitmap Tools Figure 285 Front Panel with Breaktrap Set El System Front Panel File View Options Utilities Tools Help yd ta 2 3 ERI oe dv S A S en a v Action Fit Soft Keys lome o Wa m RA reo rei reo res res Fes Fis Program Date Time August 06 2003 02 05PM Device deviceHame Serial Ho 28 Lot Alpha numeric Flow flow Operator 58 operatorHame Tester ID ccastaldi dxp DIB part HA DIB serial HA Engr Login Logoff Hode Engineering Breaktrap Settings E Debug Slices Bank A Debug Slices Bank B Debug Slices Bank C Debug Slices Bank D OM Pause Step OmBreakHeas BreakTestSeq BreakFail OLoopTest O LoopBeas FrontPanel Messages Breaktrap NUM 02 05 32 PM 6 Click the Pin Monitor button on Front Panel to start the Pin Monitor application 7 Click on the Level Time Setups tab 8 Select a Level Table either by clic
169. ET name Generally only t one each of i these items is include socket h required PINGROUP name resource name TEST name BINTABLE name FLOW name EVENT MAP name The KTL is made up of several levels of abstraction The highest level defines the sequence of tests that are performed using references that then point to the next level of abstraction which in turn is made up of references that point to another level of abstraction Figure 27 illustrates two of several levels of abstraction used in the KTL The first level the flow defines which test is executed first What follows depends on whether that test passes or fails Typically when a test fails the device is assigned to a fail bin Kalos 2 User Manual 43 3 Test Program Definition Figure 27 Flow Levels START Perform user specified tests based on specific events EVENT MAP Test syntax for the Opens test Opens lp Bin 2 i TEST Opens TEST NO 100 Shorts Bin 3 DESC Test for opens 1 SEQUENCE i opens_lev InputLeak i Bin4 all to lo seq Y opens pmu MEAS PMU OutputLeak A Bin 5 y Y ICC ip Bin 6 Y Standby ip Bin 7 Y Bin Table Syntax Chip EraseVerify Bin 8 a 3 BINTABLE Bins l name hard soft XPASSIFAIL
170. EVENT MAP JSt Y 3 3 A 4 3 3 9 3 3 4 4 3 03 93 333 03 3r n nn nn n f BINTABLE EDGESET edgeSetsO Za CONFIG noop PERIOD 15ns ALLPINS G2L Ons de 3 SRI ARGUI ARANA RAR ARANA RANA RARA AR AREA ARERR ERT PATTERNS LL RRRRERRRR RAAT ARERR AAA AERA AAA AEREA A AREER Not connected NUM A Table 4 provides a description for each menu option in the File pulldown window Table 4 Kedit File Menu Description Option Function m o New Create a new KPL KTL KPJ C or Other text file Open Open an existing file Close Close the opened test program file 60 PN 071 0359 02 October 2005 Kedit Table 4 Kedit File Menu Description Cont Option Function Open Workspace Open a workspace file for editing modifications Close Workspace Close opened workspace file and all associated files Save Save edits modifications Save As Save an opened file under another name or to another location Save All Save all modified files Print Print a file to a specified printer Print Preview View file as it will appear in print Page Setup Setup printing specifications Recent Files View file names of the previous four files opened Recent Workspaces View workspace names of the previous four workspaces opened Exit Exit Kedit Concept of the Workspace When using Kedit you can open a Workspace to enable modification or creation of associ
171. FF0000FFFFOO00FFFFOOOOFFYFFG 10021000FFFFODO0FFFFODO0FFFFOOOOFFFFOODOKG 100220000000FFFFO000FFFFOO00FFFFOO00FFFFDG 10023000FFFFO0000FFFFOOO0FFFFOOOOFFFFOO000CG6 71007 40000000FFFFOO000FFFFOO0OFFFFOO00FFFFDG 10025000FFFFODO0FFFFODO0FFFFOOQOFFFFOODOAG 100260000000FFFFO000FFFFOO00FFFFOOO00FFFFS6 10027000FFFF0000FFFFOOO0FFFFOOOO0FFFFO00086 100200000000FFFFOO00FFFFOOOOFFFFOOODFFYF76 10029000FFFFODO0FFFFODOOFFFFOOQOFFFFOODOGG 1002A0000000FFFFOO000FFFFOOO00FFFFOO0OFFFFSG z1002B000FFFFODOOFFFFOOO0FFFFOOOOFFFFO00046 zX002C0000000FFFFOODOFFFFO00DFFFFOODOFFFFIG NOTE Kalos currently supports only BY8 BY16 and BY32 The example shows 16 Bytes per line Record Type first 8 positions Data 9 through 40 Checksum 41 and 42 e 32 Bytes per line Record Type 1 through 8 Data 9 through 56 Checksum 57 and 58 348 PN 071 0359 02 October 2005 Example Printout of a DBM hex file 020000020000FC 020000040000FA 10000000FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFOO 10001000FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFO 10002000FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFEO 10003000FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFDO 10004000FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFCO 10005000FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFBO 10006000FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFAO 10007000FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFF90 10008000FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFF80 10009000FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFF70 10FF DO
172. File Get ECR via Mode Selected same as Get ECR Data via Mode Selection File menu definition above 7 Set ECR via Mode Selected same as Set ECR Data via Mode Selection File menu definition above 8 Width Bitmap width display phe de x que e 9 Array Bitmap array display 10 Array Blocked Bitmap block array display Kalos 2 User Manual 525 7 Shmoo and Bitmap Tools 11 IO Scrambler I O positioning 12 Readback Expansion read back override 13 About displays the Bitmap About dialog box Figure 302 Bitmap Toolbar Bitmap Application File Edit View Utilities Tools Help so SG mm An LAA DD DOO OD amp Go DQ O Bitmap Property Page The Bitmap Application provides two 2 display options as shown in Figure 303 dependent upon the system monitor settings 1600 x 1200 1Mbit display 1280 x 1024 256 Kbit display NOTE Any setting below 1600 x 1200 but greater than 1280 x 1024 will configure to 1280 x 1024 526 PN 071 0359 02 October 2005 Figure 303 Bitmap Property Page Bitmap and Mega Options Fle Edt Yew Ubities Tods Hep aja ia a uou BLU v ZW TIT Im Both Peer Reedy Tredltre Ld IIS AM E Bitmap Application Fie Edt View Utities Tools Help d m s ale A E LIA LM DEA 256 Kbit 10 IMEM_A Test
173. File select File gt Export Setups 7 The shmoo plot can be printed by selecting Print from the File menu item 492 PN 071 0359 02 October 2005 Pin Monitor Pin Monitor Pin Monitor is an application which allows the user to evaluate the performance of a DUT on a per pin basis The evaluation is performed by creating one dimensional shmoo plots of each resource that is allocated to a pin This provides detailed resource marginality information of the device and is also helpful in debugging applications In order to use the Pin Monitor application a breaktrap is set in the Front Panel on a functional test Refer to Example 1 page 503 for information on breaktrap setting The Pin Monitor application is separated into the following six tabs moe A SS 6 Pin Monitor tab Power Setup tab Level Time Setup tab Level tab Times tab Socket tab When selected each tab provides a viewer window for the respective selection of the application A description of each viewer follows Pin Monitor Window The Pin Monitor window is used to view the shmoo plots that are generated by the tool This window is divided into six subtabs which organize the tester channels type The user may generate the plots by individual channel or as a group see Figure 277 Kalos 2 User Manual 493 7 Shmoo and Bitmap Tools Figure 277 Pin Monitor Window Shmoo Application File Edit Utilities Tools Help
174. Find And Replace dialog allowing the user to find a specified value or vector character in the LDTool window and replace it with another value or vector character Opens the Find And Replace String dialog allowing the user to find a specified string in the LDTool window along the rows and replace it with another string Opens the Find And Replace Column dialog allowing the user to find a specified string in the LDTool window along the columns and replace it with another string Opens the Go to dialog allowing the user to jump to the desired line or fail in the LDTool window Opens the VectorChar Info dialog and shows the vector character definitions Clears the data only in the currently opened window if itis the LATool DSTool or Datalog window or in all windows if the LDTool window is opened When the user turns to Online mode the List of active modules Arm and Trigger Conditions Get Vector Data and Clear buttons become active Online Offline If there is no data in SRAM then after clicking the Get Vector Data button the following message will be displayed Error no logic pattern loaded If SRAM contains data then after Get Vector Data the Save Set Vector Data Run Find Find And Replace Find And Replace String Find And Replace Column Go To and Show VectorChar Info buttons become active and the List of Active Modules button become inactive see Figure 190 326 PN 071 0359 02 October 2005 Logic Debug To
175. For in depth information on each KTL statement refer to the applicable section of the Kalos 2 Test Language KTL Chapter in KITE Reference Manual Kalos 2 User Manual 53 3 Test Program Definition CYCLE NAMES The CYCLE NAMES statement lists the names used for cycles in both the CYCLE TABLE statement and pattern file If a test program contains any CYCLE TABLE statements a CYCLE NAMES statement is required and only one is allowed CONSTANT A program is easier to read and change if certain numbers are assigned a name A CONSTANT statement assigns a unique name to a defined value Once defined a CONSTANT is substituted anywhere within the test program where a value or variable expression var expr is used VARIABLE A VARIABLE is a storage place for numbers When it is created it is assigned a unique name and a value using the VARIABLE statement Once created and assigned a value it may be substituted anywhere within the test program where a number would normally be used The DPSSET PMUTEST TSET TABLE PSET TABLE TIMING and LEVELS all accept variable expressions var expr when assigning values to their associated resources DPSSET The DPSSET statement sets up the device power supplies There are four device power supplies on each Kalos 2 slice For the Kalos 2 xp eight device power supplies are available on each Kalos 2 slice Two four are referred to as VCC normal voltage supplies and two four are referred to a
176. Gp Stop Zn Ea Zon A TZ EMUI MEM AY 40 Array Bitmap Scale 1 1 24 Bitmap Mbit display lol x MegaMap Scale 1 4 1 2 1024 x 64 2274 43 Note Bitmap Display is 256K bits maximum with less than 1600 1200 Display Settings credence D g M us Bl 077 KALOS 2 Copy Copy mer Armen e MEn DEn A Clear MEMA Kalos 2 User Manual 527 7 Shmoo and Bitmap Tools The Editor property page subtab see Figure 304 allows the user to change the bitmap by width row or column This option is normally used to generate test suites however it can be used as a compare feature by highlighting specified areas Figure 304 Bitmap Editor Fie Edt Yew isc sal oT RI Subtab property page selections a The Scan property page subtab allows operations for executing a Setup scan 1D Shmoo plot The Scan operation consists of two steps for gathering and displaying Bitmaps The First step is to execute a 1 D Shmoo plot using the selected Setup Variable parameter Then the user must select a datapoint on the visual 1 D plot and re execute single point the selected point If the selected point has failures it gets current data from the selected Failed Memory and displays the results to the Mega and the Bitmap using the defined display settings In Figure 305 the Bitmap Scan shows the initial control for t
177. Graphics selection provides viewing options for bar graphs or pie charts opposite TYPE Sort soft or FBins viewing selections are available opposite BINS see Figure 84 Primary Window The primary window of the Summary feature is divided into view or control areas See Figure 85 for the location of the following areas 1 Menu and toolbar Interface for selecting the operations of the application 2 Property page tab Functional page selection Text Sums Graphics 3 Control area Specify control and or mode selection 4 Slice tabs Select Kalos 2 slice s for viewing Kalos 2 User Manual 129 4 Introduction to KITE Kalos 2 Integrated Test Environment 5 Draw area Displays selected views 6 Current status messages two locations Displays status and messages Figure 85 Primary Main Window system Front Panel File View Options Utilities Tools Help 1 to SY HU Hs lt S O A v eea nara dt redee Action F Soft Keys ma mo mo rx me me rc me reo reo re reo rs reas mes ree ME Active Slices Bank A Active Slices Bank B Active Slices Bank C Active Slices Bank D an Haa DIB Info Text Sums Graphics All Summary Summary Slices Bank B Summary Slices Bank C Summary Slices Bank D C4 TTT Tester ID kneves dxp Date April 18 2003 12 48PM Program AK2 multiDut4 Device deviceN
178. Ha 10 000107 00 B ies Kalos 01186315W 10 000127 00 B D Board EMU BACKPLANE DPS 02320275 02311095 PMU BACKPLANE Show the configuration of Kalos Slice 10 Save To IDROM IDROM information can be copied or saved on the hard drive or to a portable drive The procedure follows see Figure 114 Launch the Idrom utility M Not Present Not Present Not Present Not Present 10 000107 00 B Ink s 10 000127 00 B D Not Present Not Present Not Present Click on Kalos to read the Kalos board xxxxxxxS from Lot Number 3 Save all IDROM data by selecting File from the menu bar option then select Generate Report 4 Select all slots to be saved Click Save to File save the file in txt format Open the txt file in Notepad or Wordpad 182 PN 071 0359 02 October 2005 Idrom Property Page Figure 114 Save to IDROM Procedure Online tdrom MIBE ontine idrom D Ede View Help wIs w vi oft 2 3 4 5 5 7 98 9 n 1 1 14 T 1 Serial Part Number Rev Eco 671 4619 00 02380045 10 000107 00 B H 01186315W 10 000127 00 B D c 288 Meg SRAM Prototype 671 4588 00 A c 288 Meg SRAM Prototype EA Meg ETX Pentium I 118 7970 00 64 Meg ETX Pentium I 671 4689 00 671 4619 00 02320275 10 000107 00 B 02311095 10 000127 00 B H D Not Present GA Mag ETX Pentium I ny 118 7970 00 64 Meg ETX Pentium I 671 4689 00 K2 Backplane IDROM Device Selection
179. II dll is no longer supported however it remains for legacy applications only DLLs must adhere to a specific structure of exported functions to be correctly loaded and initialized by DE EXE Call functions exported by main EXE can be included Refer to Custom DLL Creation for additional information on DLL structure and adding user custom DLLs Although DLLs for both Data Engine and Dlog Engine have the exact same functionality they are NOT interchangeable All created datalog files are processed by a postprocessor By default the postprocessor is one batch file for all DLLs def move bat which copies generated files to a destination folder this can be a network folder It is possible to have different batch or executable files as postprocessors for each DLL refer to Postprocessor DE GUI A DE icon refer to DE menu with Data Engine Icon is displayed in the system tray near Windows clock Right mouse click to invoke the menu Kalos 2 User Manual 355 5 KITE Utilities e Settings displays DE settings dialog About displays DE about box e Exit closes DE Figure 210 DE menu with Data Engine Icon Settings About Exit mo Be 4 54PM Settings Dialog The Settings dialog permits switching on off generation of certain file types This dialog is locked out in production mode Kalos production ini file contains all of these settings refer to Configuration with kalos production ini but changes in t
180. KALOSO 2 Series User Manual October 2005 PN 071 0359 02 Credence Systems Corporation 1421 California Circle Milpitas CA 95035 Tele 408 635 4300 Fax 408 635 4984 Customer Service Center 503 466 7678 North America and International 800 328 7045 Toll free within the United States call center credence com Internet email 503 466 7814 Fax credence Legal Notice No part of this publication may be reproduced or transmitted in any form or transcribed stored in a retrieval system or translated into any language or computer language in any form or by any means electronic mechanical magnetic optical chemical manual or otherwise without the prior written permission of Credence Systems Corporation Credence Systems Corporation makes no representations or warranties with respect to the contents hereof and specifically disclaims any implied warranties of merchantability or fitness for any particular purpose Furthermore Credence reserves the right to revise this publication and to make changes from time to time in the content hereof without obligation of Credence to notify any person of such revision or changes Restricted Rights Legend Use duplication or disclosure by the Government is subject to restrictions as set forth in subparagraph c 1 ii of the rights in Technical Data and Computer Software Clause at DFARS 252 227 7013 or in subparagraph c 2 of the Commercial Computer Software Restricted Rig
181. KK KKK KK KK 33333332 kk kk kk kk kk kk k kk kk kk k kk KK KKK 54333333 kk kk kk kk kk kk k kk kk kk k kk kk kk A 4 000 V 555544433 XX kk k kk kk kk k kk kk k kk KK KKK KKK 55555544 kk kk kk kk k kk kk kk k kk KK KKK KK KK KKK 6655555 X kk kk kk kk kk kk k kk kk k kk kk kk ok kk KK KK 666555555 X X X k X kk k kk kk kk k kk kk k kk kk KK KK KK 16155555 A A X k kk kk kk k kk kk kk k kk kk kk kx x kx x 3 000 V 88711666 k X kk KK KKK kk KKK KK KK KKK KK KK KKK 9888877 k kk kk kk kk kk k kk kk kk kk KK KKK QBBEBBBBXKKKKKK KKK KKK KKK KK KKK KK KK KKK 99999099 x k X kk kk kk kk kk kk KK KKK kx x KK 999098 X X XX kk kk kk kk KKK kk KKK KK KK 2 000 V 000999888888888888 ooo x 482 PN 071 0359 02 October 2005 Figure 269 3 D Pass to Fail ASCII Printout Examples Options Program filename Ser 1 Lot T Date mon day year time Comment user statement Level tablename Time tablename Pattern sequencernam X Axis VariableName Start 10 00nS 0 500nS Steps 50 Stop 35 00ns Y Axis VariableName Start 5 000 V 0 125 Y Steps 15 Stop 2 000 V Y Axis VariableName Start 2 500 V 0 100 V Steps 10 Stop 1 500 V Pass to Fail 3D Shmoo Plot All Fail 1 2 400 V 2 2 300 V 3 2 200 V 4 2 100 V 5 2 000 V All Pass 6 1 900 V 7 1 800 V 8 1 700 V 9 1 600 V 0 1 500 V 5 000 V 888888999909 kk k kk KKK KK KK KKK KK kk KKK kk KK KKK KK KK 888899990
182. LINE patLvm96x4V6 The first five columns show the following data No Cycle number Vector Addr SRAM Vector s address in SRAM Uram Addr URAM Address Arm state a check mark indicates arm occurred AH on that URAM 316 PN 071 0359 02 October 2005 Logic Debug Tool Trigger state a check mark indicates trigger Trig occurred on that URAM Pass Fail red F indicates Fail empty cell Fail a means Pass The PG and TG fields allow the user to view the PG TG data Right click the top part of the PG field to open its context menu and select the desired resource to display the column of its values Selection of resources to be displayed are shown in Figure 180 Figure 180 Resource Selection Addr Addr M Show All Ox0 O O Hide All Ere Loop Cntro Ox0 0 O Loop Cntr1 Ox0 D D Loop Cntr2 OxD D D Loop Cntr3 OxO O D Cycle Cntr oxo D 0 Repeat Cntr oxo 0 D Refresh Cntr ox0 0 0 LYM Addr LYM Cycle oxo O D i magna 17v Addr M mm Data M d v Addr N Ox0 O O Match Cntr Ox0 O O Stack Addr oxo D D Oxo 0 0 Users can also Show All or Hide All resources at once Each cell of the PG field is provided with context menu allowing selection of radix in Figure 181 Kalos 2 User Manual 317 5 KITE Utilities Figure 181 Selection of Radix O 3 0 v Hex Dec ie t N Hide Addr M OxO O O 0x0 O O The TG field also allows the user to view da
183. Manual 241 5 KITE Utilities Type X Scale This is divided into sections The first section cannot be edited and displays the waveform type RRECT CRECT or Polar The second part provides a drop down list for the selection of one of five components VALUE REAL IMAG imaginary MAG magnitude and PHASE To choose a new component for a given waveform type 1 Click the down arrow in the second part of the Type field 2 Choose a component Not all components are available for each waveform type RRECT Value is the only selection CRECT Choices are REAL and IMAG Polar Choices are MAG and PHASE The new component displays in the waveform patch to the right X Scale field includes Scale Units Prefix Units Zoom Up Down Each of these variables pertains to the current division note the Div designation at the end of the field Scale This is the relative scale of the X graticule marks It can be changed to a preselected scale by using the drop down list or any desired scale can be entered in directly Units Prefix This field works in conjunction with the Units field To specify a time fraction 1 Click the drop down menu in the middle of the X Scale field 2 Choose the Units Prefix n nano m milli etc Units The units from the TOS Interval units box are included in scale display but cannot be modified here 242 PN 071 0359 02 October 2005 Waveform AWT Zoom Up Down
184. Manual 463 7 Shmoo and Bitmap Tools ASCII Outputs Standard and optional shmoo plot ASCII base hardcopy printout options are available to users The following is an ASCII representation of the three types of datapoints Standard 1 Fail Pass Not tested Optional Fail Pass 4 Not tested Socket File Property Page The Socket File Default property page shown in Figure 254 provides a viewer that displays the socket definition of the initialized tool Two other views are available under Socket File Get Online and Interactive The default socket file has no relationship to any device type Its primary use is to ensure that the application was initialized with predefined conditions 16 lOs 64 k of Addressing and Device Symbols from Pn00 to Pn47 To modify the name associated with a particular device pin click the left mouse button in the Device Symbols column Clicking the left mouse button in the Pin Definition column allows you to modify a pin s type i e INPUT ADDRESS NULL The Assignment Type column allows you to modify the pattern generator assignment for a pin see Figure 254 The Interactive button provides the option of editing the internal shmoo socket table 464 PN 071 0359 02 October 2005 Setting Up the Shmoo Plot Figure 254 Socket File Property Page Default With Interactive Enabled File Edt Utities Took Hap bals NOTE The Socket File defaults property
185. NLINE patLvm96x4V6 The conventional symbols used in this window are described in the first five rows of the The leftmost column in the WaveForm window is provided with the same context menu as the headers of the CHANNELS DEVICE PINS columns in the LDTool window The Scale row presents the time scale The values of time points are presented in terms of ns The scale is provided with the following context menu Kalos 2 User Manual 307 5 KITE Utilities Change Scale Dialog This dialog allows the user to set the index by choosing the desired value from the Index combo box or by moving the slider at its right Figure 175 Change Scale Dialog Change Scale Scale Divide by 5m Line Line thickness 3 pixels v Offset 5 pixels v Users can also set the thickness of the waveform lines using the Line thickness combo box as well as the line color using the sliders for Red Green and Blue LATool Window This window provides graphical view of the programmed pattern waveforms and actual measured waveforms for the selected pins or pin groups 308 PN 071 0359 02 October 2005 Logic Debug Tool Figure 176 LATool Window Logic Debug Tool DEK File Action Edit View Options Help INPUTS Cycle O 1 2 3 4 5 11 Time pS 0 1000 2000 3000 4000 5000 6000 7000 8000 9000 10000 11000 12000 Sample 0 Iv mim gt LDTool Datalog LATool DSTool Ready N A LYVM MODE ALLPINS The
186. Name Samples Interval Stack position displays the waveform s position on the stack of waveforms Stack position O is the TOS top of stack stack position 1 is the next waveform etc This parameter cannot be directly edited it is updated after push pop create and other operations which change the number of waveforms on the stack This field displays the name of the waveform To edit the name of a waveform 1 Delete the current contents of the Name field 2 Enter the new name with an optional extension This becomes the new name of the waveform file NOTE If you enter an extension the extension is kept if you do not enter an extension an appropriate extension is added for you Leading and trailing spaces are removed and all spaces within the name are converted to underscores 3 Press the Enter key This field displays the number of samples in the waveform To change the number of samples in the waveform 1 Delete the current contents of the Samples field 2 Enter the number of samples 3 Press the Enter key At the Confirmation dialog click OK The Analog Wavetool then performs a cubic spline interpolation on the waveform to give the desired number of samples This operation deletes the original waveform data There are three parts to the Interval field 1 Value 2 Units Prefix 240 PN 071 0359 02 October 2005 Waveform AWT 3 Units Each of these variables pertains to the current sample
187. O etc is recommended Using a DPS identifier generates a warning message when compiling 46 PN 071 0359 02 October 2005 Test Program File Figure 28 Socket Table Kedit K2 demo EJ File Edit view Compile Tools Options Window Help Dm ck F B S G Ki ti SKE ooo 14454 2 enn byw tu PP a Ht SOCKET CONSTANT AAA El VARIABLE SOCKET single amp Eh DPSSET Dpn pin name pin type assignment channel a PMUTEST DP1 VOLT SEL INPUT PIN NA 0 48 w LEVELS DP2 CE 1 INPUT PIN NA i 49 amp Th TSET TABLE DP3 NC 1 GND PIN Eh FSET TABLE DP4 A20 ADDR_PIN x14 2 50 DPS 29 ADDR_PIN x13 3 51 f PSET TABLE DP6 a18 ADDR PIN xi2 a 52 Eh CYCLE TABLE DP A17 ADDR PIN X11 5 53 T TIMING DPS 216 ADDR PIN xio 6 54 a Ea AXIS DPS vcc o PUR PIN DPS VCCO Ea SHMOO DP10 A15 ADDR PIN xe 7 55 Bo VLOG DP11 MA ADDR PIN x8 8 56 amp El PATTERN DP12 A13 ADDR PIN x 9 57 El LOADDEM DP13 A12 ADDR PIN x6 10 58 DP14 CEO INPUT_PIN NA 11 59 f SEQUENCE DP15 RP INPUT_PIN NA 12 60 Ea TEST DP16 Mi ADDR_PIN x5 13 61 low current pnu test DP17 A10 ADDR PIN xa 14 62 high current pnu test DP18 as ADDR_PIN x3 is 63 K2 tine Shnoo test DP19 a8 ADDR PIN x2 16 64 Kl tine Shnoo test DP20 A7 ADDR PIN xi 17 65
188. O0FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFBl1 10FF EOO0FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFAI 10FFFOO0FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFF91 00000001FF Test s uite default Q16 4 M DBM Editor DBMEDIT Kalos 2 User Manual 349 5 KITE Utilities Figure 208 DBM Editor Default 16 Wide 4 Megs Addressing Conditions Layout Data Buffer Memory SRAM quadrant DUT addressing bank 10 01 Addressing 0000000000000 0 Rows 12 Columns 4 Data Width 16 1111111111111 0 DBM variables 0000000000000 1 m nlOs 16 DperA 4 vmax 4194303 1111111111111 1 Multiple DBM Files Per Program In the releases of Kalos software versions 1 9 5 and higher the end user is allowed the flexibility to choose between one of multiple hex files to load with the device program This is accomplished by declaring a generic load within the KTL program and using a project file KPJ to list a configuration that points to a source directory for the DBM files The syntax for both KTL and KPL is listed below KTL Syntax LOADDBM hex dbm FILE hextest This generic file is required to be in PGDBM DBM1 the subdirectory with the object files DUTWIDTH 16 CHECK TRUE he KPJ Syntax Minimum requirements NDBM D s program selection description Socket single Name of the Socket table to load subdir TEST DBMD Subdirectory for the object code d
189. OG Engine True Success Register DE callback False Fail function for certain tt event refer tb const type Type of the event Custom DLL API char CB FuncName inu of the function to const dlogType 0 Internal use only i True Success gei eevice m9 IDI DEVICE INFO DI DEVICE INFO Destination buffer for Kalos Types Conversion to String Return Value Description of Function Name Description Return Value Parameters Parameters Returns units string Units string for ELEC structure like V A 2 Ohm ELEC elec ELEC structure etc Returns string ELEC string kdx getElecStr representation for ELEC structure ELEC elec ELEC structure constchar ELEC string Returns string ELEC elec ELEC structure Destination buffer for ELEC string Standard Functions kdx get unit representation for ELEC structure char elecStr LIMIT structure LIMIT limit LIMIT structure Returns string dlogtype string representation for kdx get dlogtype str dlogtype member in Relums string kdx getLimitStr representation for LIMIT structure dlogtype value og Type sins representation for Vlog type member k t vlogt tr dx get vlogtype str vlog type value DLOG VLOG MSG datalog structure Kalos 2 User Manual 389 5 KITE Utilities Returns string RESULT string kdx get RESULT str representation for RESULT enum RESULT r RESULT enum Returns str
190. OH VOL IOH IOL VTH and VIHH A collection of routines data or other material in a file from which a user can draw for use in a project such as a test program 546 PN 071 0359 02 October 2005 link lot LSET LV LVM mask memory module microRAM uRAM module multidie probing multisite multisite testing MUX non volatile 1 scan The data fed to a scan pin on one scan clock cycle the scan equivalent of a parallel vector 2 To join together two or more separately compiled program modules usually with additional library modules to form an executable program device production context A group of semiconductor devices usually from the same production run treated as a unit Level set Large vector memory This refers to the memory module when used in vector testing mode Linear vector mode PMODE 1 To set a comparator state used to ignore the result of a comparison The memory module of which there are two per board This memory can be used for DBM ECR or Vector testing The internal memory of the PG ASIC A user s test pattern is stored in the microRAM of the PG chip Synonym for Kalos circuit board Comprises two slices Using probes on several dice on a wafer to conduct a parallel test of more than one die at a time Refers to more than one test site on a single test head Using a single test program and a single test head with more than one test site to te
191. Pie Charts Clicking the Pie Charts button displays a pie chart view of the composite All summary Figure 88 is a pie chart representation of the previous summary text table The draw area is divide into two sections Sort Soft or FBins summary selected from the BINS option and the pie chart The Sort Summary consists of a color key for each sort number and its respective Pass Fail assignment The Pass Fail assignment is determined by the bin table in the current program The pie chart is a graphical display of the die counts versus the selected bins categories converted into pie slice percentage of a whole NOTE This is a viewer only property page Interactive operations are not available Kalos 2 User Manual 135 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 88 Summary Pie Charts lala File View Options Utilities Tools Help ta e y 0 8 bios S AO wl IStart Stop Action Fit Soft Keys FK1 FK2 FK3 FK4 FKS FKG FK7 FK8 FK9 FK10 FK11 FK12 FK13 FK14 FK15 FK16 A aii Text Sums Graphics Summary Slices Bank A Summary Slices Bank B Summary Slices Bank C Summary Slices Bank D Sort Summary IE AS E O A N A 3533 czzzzzzz 2555522 g FrontPanel Messages NuM 02 03 41 PM Wafermap Feature The Wafermap feature
192. R REDE KET ERR KA EGRE RR 98 Target Manage us acid ie a a ri ROC ER bane Ron WC RC eke ed CRUS MGR ded res ru eee 101 Target e A PAA 101 Show Target Manager Log 2e x RRGECRG AGING LANG BABY BRAD x AMANG 102 Removing the Target Manager es 103 Loading Test Programs Projects in KITE 0 00 eee es 104 Test Program Load Setup 2a aa se KG Ha waa a RR RR A NG AKA EE E E reae 106 Front Panel Interface nh 108 KITE SoftWare eresie kinse a a KA DAG 110 Staring KITE serr aee p 110 Graphical User Interface nananana aaka 110 Men Baf ienr errs ena RC aaa 110 Toolbar sese REG aa a a A KK UK OEE RTE 114 IECIT 116 Function i CP 116 AGING SITES meddir 9 5 Ga dna EURIBOR A o b bU Oo ap eim eaten ABS 116 Overview een 117 Operator IF Property Page s ssss see RE RR ERE RE 120 DIEM rees nren a a e a aa e doa iaa BA E a 121 PALA 123 SUMMA varela roger DARAAN ALAGAAN AGO 126 e aaa NAA A NA BALA Mei ees NA Ha PRA 144 Yield Monitor ee 151 sm T 152 DBM SRAM Viewer in Front Panel lessen 155 History RAM Control oi duni mci ook E HEC AGA don d wedded aca ee oar Ro KERI 158 History RAM Theory cxa dritto Re nb core i Wa BAGA andae Wee et 160 An BA Ng duit PAS PAANAN PNR AA dut dep E 165 Pi AA 166 Breakirap Settings cns nk KA ER REA eee Rak ee RA RARE 169 Implementation es 170 TOS capt eating dia a AA Le Ad 170 Measurement 000 cc
193. Run Clear Current Window Edit menu items Undo Redo View menu items Go to v Toolbar v Status Bar Saves the data of the LDTool window to a vbd file through the Save dialog Ends the current LDTool session Switches between online and offline modes Reads from SRAM and shows the currently loaded patterns Loads the edited data back to SRAM Starts pattern running Stops pattern running Clears the data in the LDTool and Datalog windows Reverses the last edition of any editable data Repeats the last reversed edition Opens the Go to dialog to jump to the desired address fail in the LDTool window Shows hides the toolbar Shows hides the status bar 338 PN 071 0359 02 October 2005 Logic Debug Tool Options menu items Arm and Trigger Conditions Settings Opens the Arm and Trigger Conditions dialog Loop Fails Loops to the first last fail upon reaching the last first fail Choose Channels Opens the Channels dialog v Show Channels Shows vector data by channels show device pins Shows vector data by pins v Show names Shows hides names v Show fall summury Shows hides fail summary Help menu item Displays the copyright notice and version number About LDTool of your copy of LDTool Kalos 2 User Manual 339 5 KITE Utilities DBM Editor DBMEDIT The Data Buffer Memory DBM Editor utility is a viewer generator and modifier of DBM Patterns These Patterns can be read
194. S 100 00 01 OE Contact 100uA 250uA 500mV 12 5 V NA 1 V PASS 100 00 01 WE Contact 100uA 250uA 500mV 12 5 V NA 1 V PASS Test 133 00 01 NoLevTim 133 00 TR NoLevTim chook dprintl result message est Mdl Site PS Pin Grp Test Description Force Range Measure Range Max Min PassFail 300 00 01 ABUS InputLeakageHigh 5 5 V 12 5 V 0 A 25uA uA 1uA PASS Test 400 00 01 InputLeakageLow Test Mdl Site PS Pin Grp Test Description Force Range Measure Range Max Min PassFail 400 00 01 ABUS InputLeakageLow 0 V 12 5 V 0 A 25uA uA 1uA PASS Test 500 00 01 OutputLeakageHigh Test Mdl Site PS Pin Grp Test Description Force Range Measure Range Max Min PassFail 500 00 01 DBUS OutputLeakageHigh 5 5 V 12 5 V 0 A 25uA 11uA 11uA PASS Test 600 00 01 OutputLeakageLow Test Mdl Site PS Pin Grp Test Description Force Range Measure Range Max Min PassFail 600 00 01 DBUS OutputLeakageLow 0 V 12 5 V 0 A 25uA 11uA 11uA PASS Test 700 00 01 rdarrayff Test Test 750 00 01 rdarrayff LOOP Test Mdl Site PS Test Description Cycle Count CntrA 0x Z Y X CntrB 0x Z Y X CntrC 0x Z Y X Pass Fail 750 00 01 rdarrayff LOOP 0x00000000 0x00 0000 0000 0x00 0000 0000 Ox00 0000 0000 PASS m Test 800 00 01 erase device Test 810 00 01 erase LOOP Test Mdl Site PS Test Description Mem Read IO15 1014 1013 1012 1011 1010 109 108 107 106 105 104 103 102 101 TOO 7 810 00 01 erase LOOP Fail Cnt 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 810 00 01 eras
195. Save As in the main menu bar Navigate to the directory to which you want to save the waveform Name your waveform file with the appropriate extension Click OK B O m Creating and Executing Scripts In addition to all the functions available scripts that execute specific functions can be created with the display and DSP function buttons These script files can have one of two extensions aws default or cmd The dialog box for creating and executing a script is shown in Figure 160 Figure 160 Creating a Script Dialog Box Tools Configure Script Recording x Scope Mode Options fs pecordtone Script E Record CAWINNTIProfilesigsiddiquilog aws Browse E OK Cancel Help To create a script 1 Choose the menu item Tools gt Script gt Record 2 Click the Record to File checkbox Kalos 2 User Manual 281 5 KITE Utilities 3 Enter the name of a new script file that does not currently exist OF Enter or browse for the name of an existing script file to which commands can be appended To browse for an existing script file click the Browse button navigate to the desired aws or cmd file then click OK 4 Click OK All subsequent actions are recorded and written to the file specified in step 3 NOTE If the Record to File checkbox is already checked you can click the Begin Script Recording icon on the toolbar to begin recording To include comments to this file as well
196. Select which IDROM devices to program Backplane 0 Backplane 1 Backplane 2 Backplane 3 Slice A00 am aoz aos ans aos aos 407 ane aos elo Set Ship Date Cancel Help CView Utility The CView Console Viewer utility see Figure 115 is a debug viewer for observing communication messages between the CPU of each Kalos 2 board and workstation computer These communication messages show the processing of events and sequence of execution by the Test Program Executor TPE A display panel appears for each active slices CView Window The CView window opens a console display of all execution activity It is suggested that the user open the CView window at the start of each session and position the window out of the center of the CRT display where it can be seen but not as the main window Open the CView by double clicking on the CV icon in the Front Panel window or by selecting Utility gt CVIEWER from the menu bar Kalos 2 User Manual 183 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 115 CView Console Viewer Single click to open the CView window ta Mey E 00 HP Cors wl v Front Panel Toolbar CID17 CView Fie Edt View Window Options Utiles Toots Help Maia em Kalos Software Version D2 0 0 Build 0614 RELEASE Kernel VxWorks AK1 1 FCS Kalos Test Version The C
197. TE Kalos 2 Integrated Test Environment Datalog File manager Files Close Single file Save Shmoo Value User LVM Rules Func Brief Detail Shows all parametric test and results Shows the Inline shmoo from the KTL on the ASCII datalogger Value Log tests AC testing Shows Value Log from the KTL on the ASCII datalogger User defined TPEprint Allows the user to control the TPE function for the datalogger Allows the user to view Linear Vector Memory LVM datalog outputs Allows the user to view Rules check violations program versus system resources Functional tests Shows all functional tests and results Cells of the TG field show only pass P or Fail F states Shows detailed information on the states of pins Launches the Save As dialog to open or save files Enables the following functions Closes the file manager Toggles between Single file or Multi files Single file combines datalogs into a single file Multi files are per Kalos 2 slice Send current dialog to the open file User interaction manual mode to save 146 PN 071 0359 02 October 2005 KITE Software datalog data AutoSave Send current data to the end of the current test sequence Update by LINE Displays by line as received updated datalog information at EOT Displays updated information at End of Test EOT Clear Erases any information currently displayed in the window
198. TV SYNC IGNF radiobuttons and specify in the Find what edit box the value to be looked for in that column In case of searching a vector character user should select the desired range of channels Current VCD Selected and choose the vector character to be looked for from the Find what combo box To find the next or previous occurrence of the specified value vectorchar starting from the first cell of the channel s selected in the LDTool window user should select the Down or Up radiobutton and click Find Next The currently found occurrence appears in the LDTool window in gray background Find And Replace Dialog This modeless dialog allows the user to find a value or vector character in the LDTool window and replace it with another value or vector character See Figure 196 Kalos 2 User Manual 333 5 KITE Utilities Figure 196 Find And Replace Dialog Find and Replace Select Columns m TSet Any value Channels Find what C Repeat C Findwhat 12 Current inda Replace with f BS C yep C SYNC Replace with 15 C IGNF Down Up Find Next Replace Replace All This dialog provides the same finding options as in the Find dialog besides the additional Any value check box which allows replacement of any value with the value specified in the Replace with edit box beginning from the selected line in the LDTool window In case of finding and replacing a vector character the Replace with combo box offer
199. TX CPU Module pa saaag oa mada are 18 User OperationS assa cr rh ox RE REZRR EET RR ANY NA RE BEA NR E EPA 19 Operating Environment uus cee ne Ws aw oae Red RC e Ron braces bn DR CR DECR ee 20 NE WON MC 20 PC Requirements 2 rrr 20 Basic System Operation 2552 xzs RRA GRERARER ROE RA 21 Logging Into the System o bur wach PARK Sa Pak hx Eder RR RS 22 User PassWord um dicar eese ac O AA pics 23 Logging Off and Shutdown ausge x saaana KAKA RR e RR GA KI PE RUE NG Sen 25 Software Architecture enne 26 File Structure 2420253 crewed RGCRRORACERUEX KORR Re oes REGE RO PSE eee COR oa 26 CAKalos Directory se Setas ue e duce d 26 CA KalosOS Directory xe c RACE GU eae koe RACK SCR CR RR a KANA WK 27 Windows XP Interface Controls 000 0 ee 28 A PTS 28 Windows Explorer eee 29 Contr l spe pp 29 Close Minimize and Maximize Buttons sene 30 oil rx 30 Status Bap ru 31 cie JJ eae 31 Creating Shortcuts cud ues oa zea eese AA erat ates eu tardo hid RA Res 31 Launching Applications lee 33 Launching KITE vires chee chats acc te BOR WA ioe RC cadens CR i a 33 Working with Files and Folders in Windows XP 00000 eee ooo 34 Creating Folders 225 eben E BAI EP REV Ed aa doe d EE NG hess 34 Naming Folders and Files liliis 34 Moving Folders and Files 2 20 34 Copying Folders and Files sss vat uebo
200. These files launch the Kalos 2 KITE Reference Manual and the Kalos 2 User Manual respectively xxviii PN 071 0359 02 October 2005 Audience Audience This manual is intended primarily for test personnel responsible for operating Kalos 2 test equipment Knowledge of the Windows XP operating software and user interface is required The goal of this manual is to provide information that enables users to achieve maximum utilization of Kalos 2 test systems in a production environment This information may also be useful to test engineers who need a quick overview of a Kalos 2 system s architecture and fixturing features To supplement this manual users are also encouraged to participate in the formal training offered by Credence Classes that cover all aspects of device programming operation and maintenance of Kalos 2 test systems are available on a regular basis Contact your local Credence sales or service center for information and scheduling Kalos 2 User Manual xxix About This Manual Safety Considerations This section describes the safety information This information meets the SEMI S2 93 safety standards as well as those of Underwriters Laboratories UL Factory Mutual Canadian Standards Association CSA and VDE Verband Deutscher Elektrotechniker Association of German Electrical Engineers Product safety information in Credence Systems manuals serves at least three purposes 1 It helps prevent injury to p
201. To open a command file in Analog Wavetool select the desired script from the Tools menu drop down list Command files in Analog Wavetool have both the cmd and aws extensions Since the cmd extension conflicts with a Windows predefined extension the aws extension is added However both are recognized as command files in Analog Wavetool In addition to opening a specific command file from those listed on the Tools menu the Tools Script 5 Execute menu item can also be selected Selecting this item prompts you for the command file to execute This can also be done through the Execute a Script toolbar icon 216 PN 071 0359 02 October 2005 Waveform AWT Saving a Waveform Analog Wavetool has only one save option File Save As Connecting to a Tester or Emulator Not Supported at present time Setting Preferences This category includes the following features Options are set by way of the Tools Options menu item To set the number of panes sub windows to display use Tools gt Options Display tab To view selected markers use View Markers menu item or the Select Marker Type 2 icon To turn on off the scripting use Tools gt Script gt Record menu item or click on Begin Script Recording s icon in the toolbar Undo and Redo Undo and redo any operation using the Edit gt Undo and Redo menu items NOTE Undo and redo cannot be applied when scripting is on Custom Zoom To sele
202. Units parameters Paging and Scrolling in the Waveform Graphics Pane The pop up menu that appears when you right click on the horizontal and vertical scroll bars have several items that provide more control over waveform placement Page Up and Down Scroll Up and Down In addition the scroll bars on the edges of the waveform graphic pane see Figure 139 scroll all panes simultaneously so that you can view any waveform without rotating and resizing There is also a display option that enables you for performance reasons to opt to real time scroll only one patch at a time the other patches snap to the new scroll position upon releasing the mouse button This is the default Calculator Pane Access the functions of the calculator items by left clicking on the buttons 218 PN 071 0359 02 October 2005 Waveform AWT Operation The Analog Wavetool is based on a stack principle It works like a postfix pocket calculator When a waveform is read either from a file or directly from a tester it is put onto the top of the stack TOS Operations work on waveforms from the top down For example operations targeting one operand use the waveform at the top of stack Operations targeting two operands use the top two elements in the stack and so on NOTE Putting too many waveforms onto the stack causes the waveform s at the bottom of the stack to be lost with no warning message Waveform Filetypes The f
203. View Console Viewer Property Page de View Window Options Utlities Tools Heb mll al loading pattern done in 0 000000 secs PG RUN pat DO3 PC 0 CONTINUE ON FAIL TIMEOUT 0 000000 cell current execution optimized for leveltable Level nominal K2 Edgeset edgesetCommon noop pass IOs gt gt gt fail IOs 1 gt gt gt fail IOs 2 loading PATTERN pat DQ0 FILE pat DQ0 loading pattern done in 0 000000 secs PG RUN pat DQ0 PC 0 CONTINUE ON FAIL TIMEOUT 0 executing pmutest dbus ILIH alab MEAS PHU a ewiton TERM lt pat_DO2 gt FILE pat DOJ tern done in 0 000000 sees PCs 0 CONTINUE OM FAIL TIMKOUT BIN BINI dut 0 result Pass sbin 1 hbin i loading pattern done in 0 000000 secs PG RUN pat DO3 PC 0 CONTINUE ON FAIL TIMEOUT 0 00 TEST 813 cell current execution optimized for leveltable Level nominal K2 Edgeset edgesetCommon 333 noop gt gt gt pass IOs fail IOs 1 fail IOs 2 loading PATTERN pat DQ0 FILE pat DQ0 x loading pattern done in 0 000000 secs Low ERM pet DOO FILE pet DOO PG RUN pat DQ0 PC 0 CONTINUE ON FAIL lt TIMEOUT O c r e seen ODTOD 66 executing pmutest dbus ILIH gt pi O WML jue O Fesulesp 4CONTINUE OM FAIL lt TIMEOUT
204. View utility does give some run time overhead or causes additional run time in production Do not open the CView utility in the middle of a production run since it might crash the system due to an initiate CPU for communications NOTE The SHMOO in the KTL will be shown in the CView window 184 PN 071 0359 02 October 2005 Calibration and Diagnostics Calibration and Diagnostics This section describes basic calibration and diagnostics functions Kalos 2 diagnostics and calibration programs are located in the C Kalos bin directory The standard calibration program is called kcal cal and the standard diagnostics program is called kchk dia There may be other programs visible in the menu however they are not standard maintenance programs and should not be run without full understanding of the calibration software The Kalos 2 tester is automatically calibrated by running calibration diagnostics from Front Panel Calibration beyond power supplies is performed by the software which requires no manual manipulation In order to execute calibration however manual intervention is required to mount two types of load boards at various points in the process Calibration Compatibility Regardless to what Kalos OS system is running the latest software version of calibration and diagnostics must be used Enhancements and improvements to the calibration and diagnostics software help to ensure that the most accurate and robust system envi
205. W W Tester ID kneves dxp Date April 18 2003 12 48PM Program AK2 multiDut4 Device deviceName Flow standard C user message Module Summary Tested Passed 100 00 Failed Categories Sorti A00 Totals Percent 1P 20 20 50 00 2P 00 20 50 00 Soft A00 Totals 20 20 00 20 FrontPanel Messages Ready uM 12 48 21 PM Kalos 2 User Manual 127 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 84 Summary Property Page Graphics System Front Panel File View Options Utilities Tools Help la 2 EE 1 S A S S wl Active Si Active Sices Benk D F Soft Keys FK1 FK2 FK3 FK4 FK5 FKG FK7 FK8 FK9 FK10 FK11 FK12 FK13 FK14 FK15 FK16 i Bat Active Sli Bank B Bank it quy Summary Slices Bank B Summary Slices Bank C Summary Slices Bank D Sortbin Counts 5 Sort Categories FrontPanel Messages NUM 10 28 30 AM Functionality The Kalos 2 defined summary structures are divided into four groups header totals sort categories and soft categories Two tabbing methods are available for viewing text summaries Text Sums and graphical summaries Graphics To select a view left mouse click on the desired tab The graphic views may be toggled to select specific views Bar Graphs or Pie Charts are selected from TYPE The BINS selection displays Sort Soft and FBins 128 PN 071 0359 02 October 2005 KITE Software Tex
206. Workspace 61 Kedit Kalos editor 59 Kedit utility 59 213 KITE 104 546 description 96 GUI 110 interface 108 re starting 110 software tools 96 start up procedure 33 110 KITE Kalos Integrated Test Environment 20 95 110 207 208 KITE software introduction 95 KITE software operating 110 KNET 546 KPC 546 KPL 38 546 KPL Kalos Pattern Language 37 KPL debugging 81 KTC 546 KTL 38 546 file 53 file name 53 file organization 42 statements 42 KTL Kalos Test Language 37 KTL file layout 42 KTL program file 38 KTL program flow 43 LAN 546 LATool 308 launched Kedit 59 LDTOOL 112 LDTool Arm and Trigger Conditions 330 Datalog window 316 datalog window 316 Detailed Information dialog 323 DSTool 314 expanded pin group 309 main window 299 menu 338 save options 327 toolbar 324 LDTool also see Logic Debug tool 299 level ASIC 546 level table 440 level table property page 439 level values test debugger 424 levels property page 439 LEVELS statement 54 Libraries area 200 library 546 line drawing style 223 link 547 load a test program 95 Load Program File 111 Load Program operation 200 Load Project File 111 LOADDBM statement 55 loading test programs 104 log aws file 285 logging off 25 logging results 226 Logic Debug tool also see LDTool 299 login Engineering mode 152 lot 547 LSET 547 LV 547 LVM 547 560 PN 071 0359 02 October 2005
207. _id is same as machine char buf NULL Destination buffer for ID tester ID Gets tester type like Tester type string kdx get tester type KalosXP Kalos48 Fc Destination buffer for or Kalos2 char buf NULL tester type Gets wafer ID which Wafer ID string includes lot ID wafer Destination buffer f number and char buf NULL SD T checksum waler kdx_get_user_text 392 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine Part type string Gets part type gt Destination buffer for int er a kdx get wafer num Gets wafer number EEUU AR D m MA Time and Date Information Description of Return Value p Return Value Parameters Parameters a Time Date const onstchar Returns string onstchar Ero merde representation for const char fmtStr Time Date format like current Time Date Sob Yod YY YoHYo for strftime standard M S C function fe start Time Date const onst char Returns string konstchart ing s e de representation for lot const char fmiStr Time Date format like start Time Date Job Yod YY YoHYo for strftime standard M S C function sl finish Time Date Returns strin Sonet Const chart A Ee mane kdx get finish time s string g Ep representation for lot const char fmtStr Time Date format like finish Time Date Job Yod YY YoHYo for strftime standard M S C function Poo start Time Date const onst char Returns
208. a WA aai E 320 Figure 186 Detail Mode 2 0 0 ee mmm 321 Figure 187 Detail Mode 2 0 0 0 002 cee ee 323 Figure 188 Detailed Information Dial0g o ooooo 324 Figure 169 LDTool Toolbar scr erred altos ur oe hie wie 324 Figure 190 List of Active Modules eser RH 327 Figure 191 Save Dialog Window 000 cece eee 327 Figure 192 Save POL odi esr koh dara 329 Figure 193 Arm and Trigger Conditions Window 330 Figure 194 Set Get Reset Buttons a 332 Figure 195 Find Dialog i Ka ma KG KGG Es RR UR EUR OCC OR GU 333 Figure 196 Find And Replace Dialog a 334 Figure 197 Find And Replace String Dialog 335 Figure 198 Find Warning Messages 2 335 Figure 199 Find And Replace Column Dialog a 336 Figure 200 Go TO Dialog uere m PNK AKA GALE Kha KAGAYA 337 Figure 201 DBMEdit Icon pa p Naa KAG ii Kan ale AA 340 Figure 202 Toolbar suus REGERE RAMS KAKA KA KAN KA A ALACRES 341 Figure 203 DBM Editor Viewer Primary Window 343 Figure 204 DBM Editor stc uio elc Rte aeo derat Medal e EU Ae d 344 Figure 205 Socket File Default oooooooooooomoo 345 Figure 206 DBM View and Override Buffer Memory 347 Figure 207 Translation Format Hex sells 348 Figure 208 DBM Editor Default 16 Wide 4 Megs Addressing 350 Figure 209 DE St
209. afer then data collection stops Per lot in final test modifiable field default value atr cmd line 96program named wir wafer id Yoinfo wafer id96 Fields for STDF values runtime insertion For example to change the default behavior runtime setting of value for atr cmd line it is necessary to uncomment corresponding field i e remove in INI file An atr cmd line in STDF file is a value of any runtime decode string received by DE with key program name refer to Use of Runtime Decode Strings and STDF ini It is possible to specify another combination of runtime strings for that STDF field e g atr cmd line program_name _ job_revision A atr cmd line in STDF file is a combination of values of runtime decode strings with keys program name and job revision Multiwafermap Local Settings The multiwafermap creates a wafermap for both functional and parametric tests If there are multiple PMU measurements in one test it uses the results of the last one The results of the function TPEJudgeResults are also available to the multi wafermap Wafermap creates Hex wafermap Normal wafermap Soft bin wafermap Site wafermap Multiwafermap also creates Wafermaps for specific test results Selection between wafermap end multiwafermap is performed by the WAFERMAP DLL key in DATA ENGINE section 370 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine kdx Mul
210. afer summaryApp CWafer summaryApp 1 TODO add construction code here Place all significant initialization in InitInstance IMM The one and only CWafer_summaryApp object CWafer_summaryApp theApp Code for DE DLL define BUF SIZE 256 define STRBUF SIZE1024 define PRINTSTR SIZE132 define STR2HDR an int wafer summary report void Register wafer summary report function to be called at KDX END WAFER int kdx register callbacks void 1 if kdx add callback KDX END WAFER wafer summary report false return 0 if kdx add runtime str test site UNKNOWN false return 0 return 1 j We are shutting down make sure all summary reports are generated int kdx shutdown void return wafer_summary_report Called from DE EXE at the ane of wafer 406 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine int wafer summary report CString fname int site ndx hbin ndx bin num int num hbins hbin nums MAX DLOG BINS int hbin ent 0 cnt 0 int num tested num good num failed int num sites site nums MAX DLOG SITES char bufrl BUF SIZE bufr2 BUF SIZE strbuf BUF SIZE FILE fp int pf char pfc DI DEVICE INFO devInfo Before opening any file or generating a record check that there are parts tested 1f not then just return num tested kdx get total part count if num tested 0 kdx printf kdx summary
211. ager The Kalos Configuration manager is loaded separately from the standard Kalos KITE software This manager allows the user to load more than one version of Kalos KITE software onto the computer or access multi version capabilities To invoke the Kalos Configuration Manager double click on the Kalos Configuration Manager icon see Figure 62 located on the desktop or the task bar at the bottom of the desktop Figure 62 Kalos Configuration Manager Configuration Manager Once the Kalos Configuration Manager is launched the user can choose the path to the version of software to be used during the current session Click the down arrow to choose previously selected Kalos home paths Add a new Kalos home path by clicking on the browse button and selecting the home directory from which to launch the Kalos software see Figure 63 Figure 63 Software Version Selection amp 5 Kalos Configuration Manager Browse for Folder 7 x File Options Help lalm s a m KALOS HOME lt KALOS 2 gt D Kalos_ 2 apps Select a Kalos Home Directory then click OK mg CLASS EXAMPLES 3 docs drivers CJ email zy Kalos 2 H E Kalos 2 apps E List of previously selected Kalos home paths Once the path to Kalos software is selected click on the Target Manager icon see Figure 64 to start the Target Manager The Target Manager establishes connection with the target CPUs i
212. aieia ia da O s ES 327 gin AA AA 332 Find And Replace Dialog ien RR eR ERR RR ne a dh 333 Find And Replace String Dialog llle 334 Find And Replace Column Dialog 0 000 c eee eee 336 Go to DIS DO daie doi AA AA 336 LDTool Menu IPTE 338 DBM Editor DBMEDIT s ipud tor Redon RP RU Rr dod eiob Se dad Pham 340 Primary Window er p BARE AA NG PAP Re KNA Kapihan 340 Property Pages csse ka KARA KAKA RR REG AG RU REREERERGdA RAR 342 DBM EdItOT Ae T 342 Socket File eec rrr 344 DBM Viewer and Overrides Buffer Memory aaa 346 Hex Format AA ea E O Eom Sion eae 347 Example uus ab bed Ma etek ae vee tdi E tinte odit dine de dudas 349 Multiple DBM Files Per Program 60 e eee ee 350 Datalog Engine and DLOG Engine 20 0 0 ee 354 Differences Between Data Engine and Dlog Engine 354 DE HG TTC 354 DEGUN err 355 Postprocessor nre 358 Collecting Log Files for Debugging 0c cee ee 359 Offline MOE tic hun eRe nate RC AA 360 Production Engineering Modes eese 361 Disabling File Generation for Specified Flow o o o o oo ooooooo 361 Test Program Loading After Dlog Engine Startup 361 viii PN 071 0359 02 October 2005 Contents Icon Displaying Enabled Disabled State o 361 S IDF Viewer Utility 33 mr KARA oe RR ACRCOCA KAB ERROR ES EEE RARER n 362 Installation Procedure
213. all Set Up and Execute LoopMeas Breaktrap Setting The LoopMeas Breaktrap is useful when examining signals on the oscilloscope While looping on a measurement the user can launch the Test Debugger application to modify DPS Levels and Timings values on the fly The Apply Set button in Test Debugger allow modified settings to be re loaded to the ETX slice and to Kalos 2 hardware 1 Load the desired test program and select a flow 2 Select the LoopMeas Breaktrap Setting 3 Select a Debug Slice 4 Select the Read CKBD all test from the BreakOnTest pulldown menu Click on the Start button to execute the test program All tests in the flow are executed up to the Read CKBD all test The program then loops on the pattern Read CKBD all The message Looping on Measurement Read CKBD all id 2000 is displayed in the Action field of Front Panel A display of the test contents when LoopMeas is set on the Read CKBD all test can be viewed from the CView utility window 5 Click the Start button again to begin looping on the next measurement in the test flow Kalos 2 User Manual 177 4 Introduction to KITE Kalos 2 Integrated Test Environment 6 The user can stop looping by clicking the Clear Breaktrap or Stop button In both cases the pattern generator stops The difference is the BreakOnTest field shows the Null Test if Clear Breaktrap is clicked whereas if the Stop button is clicked it shows the test originally set as the Br
214. alog data All Slices and defaults to the header information only The cleared data is not retrievable Kalos 2 User Manual 147 4 Introduction to KITE Kalos 2 Integrated Test Environment The Datalog Active Slices tabs section allow the selection of which datalogging results are displayed In Figure 95 All active slices are collected and data results are displayed in the background Setups Property Page The Setups property page of the Datalog application is used to program the parameters display of the Histograms property page see Figure 96 Figure 96 DataLog Property Page Setups System Front Panel File View Options Utilities Tools Help Y tia el idi MA el Ha emo un sta stop Opens InputLeakageHigh OutputLeakageHigh OutputLeakageLow FrontPanel Messages NUM 10 41 57 AM 4 Histogram Property Page The Histogram property page of the Datalog application displays the results of the chosen parametric test The results are also based on the limits programmed on the Datalog Setups property page 148 PN 071 0359 02 October 2005 KITE Software Figure 97 Datalog Property Page Histograms EI System Front Panel File View Options Utilities Tools Help Ud tlc so a7 Hs SEO 2 2 1Start Stop F Soft Keys ro reo rea re re rc re re reo re re2 res res res reas I Datalog Setups Histograms EN E Pr
215. alos 2 test head and boards The LED s on the test head button illuminate when the switch is on The EMO switch is used for emergency system shut off It will trip the main circuit breaker on the AC controller box An auxiliary voltage for remote control to trip the main circuit breaker uses 24 VAC converted from 220 VAC through a transformer A safety circuitry guarantees 24 VAC is present at all times when the tester is on Figure 11 EMO and Test Head On Off Controls Top EMO Bottom Test Head Switch 14 PN 071 0359 02 October 2005 Kalos 2 Server AC Controller Box The main circuit breaker on the AC controller box controls the AC power to the server see Figure 12 This circuit breaker shuts down the entire Kalos 2 test system including the server and test head All power shuts off to the tester due to the activation of EMO or current overload There is also a switch on the AC controller box for accessories such as computer monitor and hubs There are eight 220 VAC outlets on the AC controller box Each uses a 15 Amp common single phase circuit breaker All accessories such as computer monitor and hubs are connected to those outlets The maximum use for all outlets is limited to 15A Figure 12 AC Control Box Test head power and EMO switch connector PC main power switch Main circuit breaker AC Configuration The Kalos 2 input power range is 3 Phase 220 VAC 100 A or 3 Phase 380 VACQ 60 A Voltag
216. ame Flow standard Lot Alpha numeric Operator operatorName 100 00 Failed A01 Totals Percent 00 20 20 20 AOL Totals 00 20 20 20 FrontPanel Messages 6 Ready Num 12 48 21 PM 130 PN 071 0359 02 October 2005 KITE Software Primary Window Functions The following is a description of features contained within the main Summary window See Figure 86 for locations 1 Control Area Text Sums Graphics Selection of text summary or graphics bar graphs or pie chart WaferMap Graphical view interpretation of the text wafermap information Location in relationship to die information behind xy coordinates pass fail information etc Interactive Allows interaction by way of pausing with a particular or problem wafer die Slices Displays text summary information of the selected slice s Phy Site Displays the actual physical site location DUTs Displays text summary information on the selected slice with an expansion of DUTs per slice File Manager File Allows the user to save the contents of the current summary to a text file This function requires clicking on the Save button Close Shortcut for closing the current file Save Saves the current summary to a named file If no filename is specified the save action is ignored LinePrinter Generates a hard copy of the current summary and sends it to the selected printer In order for the print function to wo
217. amental DC offset 264 PN 071 0359 02 October 2005 Waveform AWT Table 21 Wf Meas Function Descriptions Cont Menu Item Ratios Filt Function This operation extracts the following functions from a filtered TOS waveform RMS noise Signal to noise ratio Signal to distortion ratio Signal to noise and distortion ratio Magnitude of fundamental Fundamental bin DC offset The user is prompted for the following parameters when choosing this option Fundamental bin Number of harmonics Negative one 1 is the default that tags all non aliased harmonics to be included in the total harmonic content SDR calculation This parameter allows for the inclusion of aliased harmonics in the SDR calculation that implies that they are not included in the SNR calculation The following results are written in the transcript pane RMS noise in dB Signal to noise ratio SNR in dB Signal to distortion ratio SDR in dB Signal to noise amp distortion ratio SNDR in dB Magnitude of fundamental DC offset EffBits This operation performs an effective bits measurement on the TOS waveform It takes the sine curve fit of the waveform and compares the pure sine wave it calculated to the original waveform to get the resulting figure of merit The user is prompted for the following parameters when choosing this option ADC full scale Frequency convergence Phase convergence
218. and or the index values change the respective stop value s Figure 258 shows an example of an expanded complex setup with multiple device system resources variables Elements 1 through 4 illustrate the use of device pin DPin symbols whereas a pingroup can be substituted for these device pins if so defined Either way is acceptable The Element Edit Delete option allows you to delete any element in the table The Insert option allows you to insert an element before any other element Kalos 2 User Manual 469 7 Shmoo and Bitmap Tools Figure 258 Property Page Setup Example mui Composites Property Page Accumulate Mode The Composites property page allows users to enable or disable the accumulate modes see Figure 259 These modes are selected by clicking on the Accumulate toggle button in the Shmoo Display property page Enabling this button allows you to display accumulated shmoo data in the Composites property page The total number of devices currently accumulated is shown in the far left in the control area of the Composites property page This counter increments only if the mode is enabled the selected comparison status is equal and the selected shmoo plot is completed Two types of accumulate views are available accumulate percent 1096 steps and threshold by categories cut 96 Threshold by categories considers the input value as a cut off figur
219. anual 79 3 Test Program Definition Once the breakpoints are set the code within the flow of the loaded program is executed until it reaches the selected breakpoints This is performed by clicking on the start continue test button The file with the breakpoint set is highlighted on the toolbar If both a C source and a ktl file have breakpoints set then both file type indicator buttons are highlighted Clicking on either of these buttons clears breakpoint settings for the respective file type Using the following Step options shown in Figure 47 users can further control the execution of the code within the test program during the current debugging session Step Over Allows the user to execute the source code at the location of the cursor Step into Allows the user to execute the source code one level below the cursor level that is step into a sequence that is within a test or step into pattern code from a pattern executed within a test or a sequence Step out Allows the user to execute the source code one level above the cursor level that is step out of a sequence that is within a test or step out of pattern code from a pattern executed within a test or a sequence Figure 47 Step Control of Execution Step Into Step Over Step Out omi ae 8 O o to x byl6 As shown in Figure 48 two windows appear at the bottom of Kedit The watch window which appears while debugging allows user
220. ap Tools Figure 266 Pass Skip 2 D 1 PSkip XSteps Program filename Ser 1 Lot 1 Date mon day year time Comment user statement Level tablename Time tablename Pattern sequencernam Options X Axis VariableName Start 10 00nS Index 0 500nS Steps 50 Stop 35 00ns Y Axis VariableName Start 5 000 V Index 0 125 V Steps 15 Stop 2 000 V 5 000 V uc PE cr PP P EE DEI A c D QM PME Soe TP Karas Biag ee a P EE M NEP D HE p E M PEE ME 4 000 V DIE c c Kiana Feb NE Menit NS de phu s pM LU D spa UN ia A m A ee A EE S up Me Sua UNS Weste e e E KA Inang c A an 3 000 V aaa Uude a pna NANG ca AD E REST E E e a ck 2 000 V p p p p p t 10 00nS 15 00nS 20 00nS 25 00nS 30 00nS 35 00nS 480 PN 071 0359 02 October 2005 ASCII Printout Examples Figure 267 Boundary Shmoo PSkip gt XSteps Program filename Ser 1 Lot 1 Date mon day year time Comment user statement Level tablename Time tablename Pattern sequencernam Options X Axis VariableName Start 10 00nS Index 0 500nS Steps 50 Stop 35 00ns Y Axis VariableName Start 5 000 V Index 0 125 V Steps 20 Stop 1 000 V 5 000 V Wg hel AA A AAA eae e Wr awe e Ee A iue a imer on Rc fay RENE SERIE E vr race WU a eee ip Vm e Wa ER K gos lee Ue DEAD eR mr ASARAN
221. apply chebyshev fract double trans width double ripple double Applies a Chebyshev window function to the indicated fraction of the TOS waveform with the indicated transition width or ripple one of the two values must be zero auto increment colors on off Turn automatic color assignment on or off Turning off resets color to the default color Color 1 286 PN 071 0359 02 October 2005 Waveform AWT Table 26 Commands recognized by AWT user command Interpreter Cont Command Meaning average number int Average the TOS waveform Number specifies the number of times to average the waveform button string Put a label on a user button string is the label to use circular convolve Convolve the TOS waveform with the next to TOS waveform clear Clear the waveform stack No warning is given the stack is just cleared clip Clip the top waveform on the stack according to the next waveform on the stack clip const double Clip the top waveform on the stack to a constant value concatenate Places the TOS onto the end of the next to TOS waveform convolve Convolve the top two waveforms on the stack A linear convolution or a circular convolution can be chosen correlate Correlate the top two waveforms on the stack create band pass name lt string gt
222. arameters with command line to the postprocessor Following is the list of command line corresponding flags file type t type of file kdx stdf4 kdx summary kdx user etc inFile f name of processing file e sourceDir s source directory of file destDir d destination directory of file logFile l name of log file for messages 358 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine For example command line t kdx stdf4 s D logfiles d D VogfilesYdest f example std creates the script to move STDF 4 type file example std from D logfiles to D logfiles dest The default def move bat script consists of three main sections command line parameter parsing processing messages and errors handling In the first section script parses the command line to get passed parameters Usually this section does not require modifications In the second section of the default script the most significant is the move command from the source directory to the destination The defaults are the command line parameters move sourceDir inFile Y destDir inFile Users are free to modify this command If the source file or destination directory does not exist the script performs a corresponding error handling at the end of the batch file Error handlers write the error message to the log file and exit from the script Users are free to add error handlers here or modify the behavior of the e
223. as multiple operational modes available on Kalos 2 tester systems These operations include online data gathered using Kalos 2 Memory Tester and offline bfm files saved during online offline operations interactions The Bitmap viewer displays current online cell address failures of the device under test This includes two screen displays Bitmap and MegaMap The MegaMap is a compressed view of the total DUT s bit array whereas the Bitmap is a selected encompassed block of the MegaMap Maximum size of the MegaMap is 256 x 256 compression Maximum size of the Bitmap selected block is 1024 x 1024 or 1 megabit display Kalos 2 User Manual 451 7 Shmoo and Bitmap Tools Introduction The Shmoo Application tool is used to characterize various parameters of the DUT by creating a graphic display of the relationship between two parameters over a range of values Setup parameters are easily entered at any time for any test program The Shmoo Application tool is a viewer that shows pass fail regions of a selected device and or system variables plotted within a two dimensional coordinate system Basic features of this tool include the following One 1 D and Two dimensional 2 D plot for normal pass skip linear binary linear log and binary log shmoo plots Three dimensional 3 D plot for fail to pass or pass to fail surface displayed results in the third dimension DPS and DC parametric XY plot the XY plot of forced versus
224. asa na ee ke Ecc oc m BG AD Kee EE ae Wa KG aNG 55 MED rc laa 55 PATTERN AA AA AA 55 LOADDBM 2359 8997339 3 3 1C 9M qe eia ec AER oe o ar oa e oA as 55 SEQUENCE us ETT 56 CMODUL E wana eee X KAR RARE ORA AREA ACC Dae aes eed 56 PEI MAP wats cee PAGNAKAWAN DALA tee BKA ASIWA NAGA wee 56 CONFIO c PEE 56 Online Help Documentation eee 57 Kedit eR EID 59 Launching Kedit 2 44 xan ken ree edn ER EE ERU RE RORCEO KGoEG UR REE Re HERA KNA 59 Program Loading s E 59 Concept of the Workspace anenee 61 Resource Icons 0 0 EE E E E ne 63 Navigation and Edit Tools ico urs eh a Y Rd A 64 Standard Iools a Kag iris cheer KARGA ge MD AN 65 Bookmarks ds rerba RR E RR REL e Ro d 65 Anonymous Macros cxa wa mu kx E REREGCR ACER Ka RE ATA RR RARA 66 odo nm 66 Tool Functions es 66 Pulldown Menus ssseeee n 68 Navigating in Kedit gaang O aa eee Seats 71 Debugging Using Kedll issues teeeagehbad keke BABE ABEL ANG REA KANA 74 DEbUG Wi Cole CA AA AA 75 Debugging KPL Source Code in Kedit 2 76 Kalos 2 User Manual iii Introduction to KITE Kalos 2 Integrated Test Environment sees 95 Description of KITE us aid i botte Det Rok RU e be i a Pct a 96 Test Preparation eee 97 DUT Interface siaren pea e oce e ete e a Rhe o a RP ed 97 Test FIXtUreS ia sse ka need E Yo a ERREUR dea She Rod e b weds 97 Configuration Manager 47 03 paaa x ERE GE
225. ass or pass to fail selection Variable setups defined for 1 D or 2 D plots are available for the 3 D plot An example of a standard 3 D Shmoo is shown in Figure 262 474 PN 071 0359 02 October 2005 Setting Up the Shmoo Plot Figure 262 Standard 3 D Shmoo Plot Me nM ues Tw Ho sae 3 Dimensional shmoo fail to pass 3 Dimensional shmoo pass to fail Kalos 2 User Manual 475 7 Shmoo and Bitmap Tools None of the following options defined for plots in one and two dimensions are available for 3 D plots Pass skip The pass skip number is forced to the value of 1 e Accumulate mode Including the original datapoint the minimum number of datapoint in either axis direction is two and the maximum number is 101 origin and steps steps 1 to 100 Color assignments for the 3 D Shmoo are determined by a threshold value The reason for this is after the pass fail not tested color assignments are made only 10 available colors are left The threshold value acts like a slide bar All steps below the threshold are represented by one color and all steps above the threshold are represented by another color The steps between the threshold values are then assigned unique colors PMU and DPS Plots PMU and DPS XY plots are supported with Kalos 2 release Accumulate Mode Accumulate mode is a background operation for accumulating multiple 1 D or 2 D Shmoo plots This mode is selected by clicking on the Acc
226. ated files KPJ C KTL and KPL files When KPJ or KTL files are opened as a workspace all associated C and KPL files also open A test program opened as a workspace enables navigation using resource icons as shown in Figure 37 as well as the use of the Files tab The Files tab is used to view the files associated with the program The workspace also enables the Resource Completion feature and mouse fly by selected tool tips that indicate the type of resource symbols Fly by tool tips are messages that appear when the mouse cursor passes over a word in a text field or other GUI object such as a toolbar icon In ktl files Kedit produces a fly by display of the resource type of symbols defined with resource keywords A keywords list of supported fly by tool tips follows SOCKET CYCLE NAMES CMODULE PINGROUP DPSSET Kalos 2 User Manual 61 3 Test Program Definition PMUTEST LEVELS TSET TABLE FSET TABLE SHMOO VLOG AXIS PSET TABLE CYCLE TABLE PATTERN SEQUENCE TEST VARIABLE FLOW EVENT MAP BINTABLE LOADDBM CONFIG TIMING CONSTANT CYCLE NAMES EDGESET Kedit provides resource completion templates in the form of tool tips for the keywords shown in Table 5 The template string is displayed after the character is entered when defining a new resource Table 5 Resource Fly By Tool Tips Resource Template Keyword P CMODULE function 62 PN 071 0359 02 October 2005 Kedit Table
227. ations are located in the property page s control area top of the selected page The Get and Set buttons if available for the respective property page are used to update or send the Test Debugger current data table Some of the property pages have an Apply button which is a superior set operation The Apply executes the set function and then applies the specific resource table to the Kalos 2 hardware The Break Test button if available for the respective property page allows the user to select a specific test Break Test or select a specific slice type for editing NOTE Any restart of testing shows the effects of the modified slice resource This is because the program was permanently changed In all table displays the white areas are used for editing and the light gray areas are not available for editing The following is a description of the functionality of each property page Refer to the specific property page sections in this chapter for detailed information Overview Displays an overview of all programming slices of the loaded program No editing operations are allowed on this property page Socket A current file viewer Displays the socket file of the loaded program A sub page graphic is available for viewing the device package of choice No editing operations are allowed on this property page Flow Allows for editing of the Bin and Flow tables of the loaded program As with all table displays the white areas are f
228. ay marker Title on display marker Cycle on display marker Vector on display marker Scan off display marker Elapsed Time off display marker Cycle Set off display marker Time Set off display marker Compare on display marker Results off display marker Note off Marker Syntax In AWAV Files Marker data is stored in AWAV files Currently the only way to edit or delete markers is by editing the AWAV file generated when a waveform with markers is saved using the Save As menu item The syntax for markers in the AWAY file is as follows MSTMT marker TYPE LABEL X COORD Y COORD BLOCK BLOCK DSTMT DSTMT J DSTMT LABEL INTEGER DOUBLE TEXT TEXT STRING STRING TYPE STRING LABEL STRING Ka X COORD DOUB Y COORD DOUBLE Where STRING is a quoted string DOUBLE is a double precision number floating point format INTEGER is an integer fixed point format P Q denotes a choice between P or Q denotes repetition xyz denotes a literal Q A marker statement of type type1 having the label label1 with X and Y coordinate values of 1 0 and 2 0 respectively and having no additional data appears as follows in the AWAV file 254 PN 071 0359 02 October 2005 Waveform AWT marker typel label1 1 0 2 0 A marker statement s
229. ay such that the indicated value is at the beginning left side of the display set display x pan double Set the X display to begin at the indicated percentage of the waveform set display x scale double Set the X scale factor to the indicated value set edit mode light heavy Set the editor to the specified mode set waveform size small medium large Set the size of a waveform patch to be the indicated value shell prompt lt string gt Pop up the shell prompt input box with the specified string The string can be edited before being submitted to a shell or the input box can be cancelled without performing the indicated shell command shell string Execute the command in string by submitting it to a shell simp integr Perform a Simpson integration of the waveform on the top of the stack sin curve fit fconv double phconv double start freq double Find the sine wave that most closely fits the TOS waveform sin interp factor int Perform a sine interpolation of the waveform on the top of the stack using the indicated factor split Split the complex rectangular or polar waveform on the top of the stack into two real rectangular waveforms sqrt Take the square root of each data point in the top waveform on the stack Kalos 2 User Manual 295
230. bim Viewer overridden by Seromblieg 10 SCRW function 3 The DA image Data Takte below ls a fixed bim File Hote 1 4 Saving kim Filo will be o Text File with bim configuration Bit Image Data 538 PN 071 0359 02 October 2005 BitPower BitPower BitPower tool is an optional application that allows the user to quickly and easily analyze failed bit information collected at wafer sort Features include Compresses and consolidates bitmap files into one BitPower file per wafer Converts electrical addresses for failing bits into accurate topological addresses and physical mapping Converts and displays bitmap files for quick and easy identification of failed bit patterns at the wafer die and sub die levels Provides a graphical user interface for easy comparison of test results wafers and die and wafer lots Increases and scales wafers and individual die Displays bin types for classification Allows users to change device types by resetting die configuration and wafer description The BitPower system works with bitmap files generated during the wafer sort The system consists of a group of applications that perform various functions to convert data and analyze bit failure patterns For detailed information on using the BitPower tool refer to the BitPower Analysis System User Manual supplied with the application The BitPower tool is launched by clicking on the BitPower icon see Figure 313 o
231. bm debug window Microchip MPLAB IDE Fi Microsoft Office MKS Toolkit National Instruments fm Startup Eg Windmill F3 Xilinx ISE 5 8 Internet Explorer oy BAY vy vy ov vv vv v E Remote Assistance Next click on the To log off E Shut down or the click here Log off button again with the left mouse Pop nnde ks with the left mouse b u tto n _ gt Are you sure you want to log off b u tto n p Shut Down Windows Select Log Off or ete n Shut down on R What do you want the computer to do gt Log off ccastald Ends your session leaving the computer running on Full power OK Cancel Help The system completes any necessary cleanup and logs you out of the system This process is complete when the Login dialog box appears or the screen saver becomes active Kalos 2 User Manual 25 2 User Operations Software Architecture The KITE software operates on the Kalos 2 workstation computer an Intel Pentium processor based system The user interface is implemented using the Microsoft Windows XP operating system For the purposes of this manual it is assumed that the user is familiar with the Microsoft Windows operating environment including its commands and system file structures The following section contains a short description of the Windows interface controls that are referred to in this documentation File Structure There are two dire
232. bm source hexfiles Source directory for the DBM files 350 PN 071 0359 02 October 2005 DBM Editor DBMEDIT Launching the Operator IF is done by clicking on the Operator IF Icon in the top left corner of the Front Panel When the KPJ is loaded into the Operator IF the DBM area of the Operator IF becomes active if the keywords are in the KPJ This allows the operator to load any one of the hex files listed within the dbm source directory see Operator IF Hex Load below Operator IF Hex Load Jl P06 rimo lee sm o mn n Ready Load Time Calculations Checksums on the Kalos can be calculated in many ways One way is to calculate a file specific SUM Check This is done by loading a DBM file into Kalos Front Panel using the Operator IF version 1 9 7 and Higher The algorithm used to calculate the SUM Check simply sums the individual line checksums line checks in the hex file The result is a unique SUM check for the DBM files see Operator IF Hex Load above Within the Operator IF there is some validation for the SUM Checks to be as expected In the upper left corner there is the option to select SUM Validation Enabling this function required the person loading the program to enter the expected Kalos 2 User Manual 351 5 KITE Utilities value to the SUM check If this value does not match the calculated value for this DBM file the load operation is aborted Run Time Calculations In t
233. browser to enable selection of a file Print Prints the ASCII file depicting the current test suite s Options Set up test parameters datalogging and summary information Slices Select the channels and slots for the current calibration or diagnostic run Pause Pauses the execution of the current running calibration or diagnostic test suite Step Tests each suite manually stopping after each test Cut Removes the selected text ASCII representing test suites from the file and puts it onto the clipboard Copy Duplicates the selected text ASCII representing test suites from the file and puts it onto the clipboard Paste Inserts the clipboard at the insertion point Abort Aborts the running calibration or diagnostic Colors Edit the color scheme 196 PN 071 0359 02 October 2005 About Datalog Summary Slice Summary Channel Summary Setup Checker Clear Results 3 D Summary Expand Tree Close Tree Auto Scroll Save Summary Running System Diagnostics Displays the software version of the Calibration Diagnostic program This window must be closed to return control back to the previous window Invokes the datalog window Invokes the Summary window Displays the summary information by slice Displays the summary information by channel Displays the channels and slots chosen for testing on the loaded diagnostic or calibration program Note This feature is not implemented with this version of Kalos 2 Cl
234. c SITE MAP True Can be True False 1 0 Option to create a site map wafermap SITE MAP WIDTH 6 Character width of each bin is represented in the wafermap This indicates how wide each bin location is and it affects the appearance and readability of the wafermap This is multiwafermap specific Kalos 2 User Manual 371 5 KITE Utilities USER MAP 1 5000 Matching the test number In this case test number 5000 is represented in the multiwafermap This is multiwafermap specific USER MAP 1 WIDTH 7 Character width of each bin is represented in the wafermap This indicates how wide each map node location is and it affects the appearance and readability of the wafermap This is multiwafermap specific USER MAP 1 NAME Test 5000 Multi Wafermap 1 values multiplied by 1e9 Title of the wafermap This is multiwafermap specific USER MAP 1 FMT 2f The is required for the width to work Standard formatting based on printf parameters The is required This is multiwafermap specific USER MAP 1 MULT 9 value in nano seconds Result is multiplied by 10 x where x is the value of USER MAP 1 MULT For example if 9 were entered here the value would indicate nanoseconds This is multiwafermap specific USER MAP 1 NAME should reflect this value Refer to the example above NOTE The above settings can be repeated for additional multiwafermaps as shown in the example below This example is currently set t
235. c ns 171 pl METTE RIEE 171 SSD x bs beue bd fada ettet debo Reset antistes iterat iud eae 171 scum cq PE 171 iv PN 071 0359 02 October 2005 Contents Li Tr cc 172 Example 1 eco cae AD RR RC ee PATER CR EORR CR KAG 172 Example 2 ogc se dye deg mx aor be EORR RO E oe C Rd ANG haka ue igo 173 Set Up and Execute BreakMeas Breaktrap Setting 173 Set Up and Execute BreakFail Breaktrap Setting 175 Set Up and Execute LoopTest Breaktrap Setting 176 Set Up and Execute LoopMeas Breaktrap Setting 177 Set Up and Execute Pause Breaktrap Setting 178 ldrom Property Page Xa pagkaka REED ERR KARMA KAG REOR RACE RR ERA KAG 181 Save TO DRQM sois arre ra rai 182 O O Serene cate wo athe aac ge RG eas alae eee 183 CView Window tot des gorra Ri ERE akt dre NIA me eq As uh 183 Calibration and Diagnostics eiii gracia al cede PR IRURE OUR Ro ecg Re n qe decir ae 185 Calibration Compatibility lcs BRI 185 e AA TA a 185 e A EBA KN NGA Poe KAKA a POK eae es nena eae 185 Running System Diagnostics eere 187 Diagnostic Program kchk dia 0 cee es 187 Diagnostic Windows 4 eui en AA nn ec KNA KGG c Rh ct dca e ders 190 Diagnostic Settings KG KA cea aod Rr Rib doa Ed KAL dias Wand 191 Summary Window s xim mka Ra BAKA KED EROR Re Dea haw ACH RO AC RES 192 Running Calibration 220 hut oe ee ers nd WEE e e wc la i
236. cated The air passes out through the top of the test head where the sensors are located Once out of the test head the air is exhausted from the top of the test head out to the ceiling Kalos 2 User Manual 11 1 Kalos 2 Hardware Configuration Figure 9 Tester Cooling System Temperature sensor Kalos 2 memory board Airflow over the rest of the Kalos 2 memory board is lighter 24 pin electronic ASICs and the 2 OMNI chips heatsinks Airflow over the PE ASICS and the OMNI chips is heavy DUT and Interface Kalos 2 DUT and interface are integrated together The cable bundle connects the Kalos 2 main board to the interface unit Kalos 2 interface unit is a pogo tower integrated interface Therefore the DUT pin is a pogo pin at the end of the interface A photo of the interface unit and pin layout is shown in Figure 10 12 PN 071 0359 02 October 2005 Kalos 2 Test Head Figure 10 Interface Unit and Pin Layout Kalos 2 User Manual 13 1 Kalos 2 Hardware Configuration Kalos 2 Server This section describes the Kalos 2 server Information on emergency switches AC control box and AC configuration are discussed EMO and Test Head Switch Emergency off EMO control and test head push buttons are located on the front door of the server as shown in Figure 11 The EMO button is on the top and the test head power control button is on the bottom The test head On and Off button controls all DC power to K
237. cated on the taskbar at the bottom of the screen see Figure 22 When a program document or window is opened a button identifying it appears on the taskbar This button can be used to quickly switch between the windows that are open 28 PN 071 0359 02 October 2005 Software Architecture Windows Explorer In Windows Explorer the hierarchy of folders on the computer and all files and folders within each selected folder can be seen This is especially useful for copying and moving files You can open the folder that contains the file you want to move or copy then select and drag it to the folder or location you want to put it in To find Windows Explorer right click the Start button then point and click on Programs gt Accessories gt Windows Explore see Figure 22 Figure 22 Windows XP Start Menu and Explorer Control Menu perm Close Minimize fle Eat Wew favortes Took Hep and Maximize Q gt 3 semet D gt redes faa wc Hu x s Date Modified C PROM PILES 220 2003 6 44 6M y Docu s x f 1 07 8 Ji 9 Popoy amp s 2 X amp C ANC PROM FILES e6 Y 2 f alos 2S ase CO NF PROM PRES VO del 3i GD Documents and Settings Qu a Kaw a raos O cer Windows Qu Om max Explorer Domos con PROM FILES LO Program Fis 1D Text Document 148 Text Document LKB MS DOS Batch Fie 70B Text Document Mf11 2000 11 54 AM NB Text Document
238. choose the Tools gt Options menu item click the Preferences tab and click the Log Results checkbox To end a recording session and close the script file 1 Choose the menu item Tools gt Script gt Record 2 Deselect the Record to File checkbox or click the End Script Recording icon on the toolbar 3 Click OK NOTE To ensure the data is complete you must end the recording session and close the script file before editing or moving it The open script dialog box used to browse and select the file to execute is shown in Figure 161 282 PN 071 0359 02 October 2005 Waveform AWT Figure 161 Execute Script Dialog Box Scope Mode Options lt lt i x Look in a jsmith E EX E3 File name os ES Open Files of type Script Files aws cmd v Cancel To execute a script 1 Choose the menu item Tools gt Script gt Execute From the Execute dialog choose the script file to execute If there is already an open script file it is closed before the new file is opened 2 Click OK Monitoring Errors Warnings and Comments The transcript pane section of the Analog Wavetool window shown in Figure 162 is a scrollable text region that displays errors warnings and textual results Although this is a scrollable region it is limited Also see Figure 139 Kalos 2 User Manual 283 5 KITE Utilities Figure 162 Transcript Pan with Drop Down Edit Menu Rise ove
239. ck ck kk Ck ck kk ck kk ko ck kk ko Mk kv ko ko kx ko ko ko CC ck ck ck ck ck ck Ck Ck ck kk ck kk Ck ck kk ck kk ck ck kk ko ck kv ko k kx ko ko ko CC Ck ck ck ck ck Ck Ck ck kk ck kk Ck ck kk kk kk ck kk ko ck kv ko k kx ko ko ko CC Ck ck ck ck ck ck Ck Ck ck ck ck ck ck ck koc kk koc kk ck Sk Sk ko ko kv ko ko ko ko ko ko KAKKAAKKAKKAAKKAAKAAKKAAKKAK ko ko kv ko Mk kx ko ko ko Cc Ck ck ck ck ck kk Ck ck kk ck kk Ck ck kk ck ok kk ck kk Sk Mk kv ko ko ko ko ko ko Cc ck ck ck ck KKK Ck ck kk ck kk Ck ck kk kk kk ck kk ko ck kv ko k ko ko ko ko Ck ck c Ck KKK Ck ck Ck ck kk Ck ck Sk ck kk ck ck kk ko ck kv ko Sk kx ko ko ko OC ck Ck ck kk Ck ck ck Ck ck kk Ck kk ck kk ko ck ko ko Sk kx ko ko ko ko ko Ck ck ck ck ck Ck Ck ck ck ck ck kk Ck kk ko ck ck Sk Sk Mk kv ko Mk ko ko ko ko Ck ck ck ck kk koc kk ck kk ck kk ck kk Sk Sk kv ko ko kx ko koc Ck ck ck ck ck kk ck ck ok ck ck kk ko ck ko Sk ko ko k ko ko ko ko ko kokok OC ck ck ck ck kk Ck ck kk ck KKK KKK ko ck ko ko ko ko ko ko kokok Ck ck ck ck ck kk Ck ck kk ck ko ck kk Sk Kk kv ko ko ko ko ko ko Ck ck ck ck KKK ck ck kk kk Sk ck ck ko ko ko ko ko ko ko ko kock ok Ck ck ck ck ck kk kk kk ck kk ko ko ko ko ko ko ko ko kock KK Ck ck ck ck ck ckckckckckockck ck ck ckck ck k ck ck kk Ser 1 Lot 1 time Time tablename Pattern sequencernam Start 10 00ns Index 0 500nS Steps 50 Start 5 000 V Index 0 125 V Steps 20 Kalos 2 User Manual 479 7 Shmoo and Bitm
240. comparator in order to obtain the response The voltage range a current source or sink can produce within its constant current specifications An active load for which arbitrarily specified voltage current pairs are corrected from key pre calibrated points by interpolation on the characteristic curves of the pullup and pulldown FETs The time duration from the start of one cycle to the start of the next 542 PN 071 0359 02 October 2005 DAC Module data collection data logging data reduction DBM debugger DFT DG DGRAM diagnostic tests die diode bridge DPS DRAM driver Digital to analog converter module This module works along with the level ASICs to control pin levels for all of the tester channels The collection of selected information in a file during a specified operation The recording of selected information during a specified operation such as data recorded during a device test run The transformation of raw data such as that logged during a device test run to human usable forms such as graphical representations and tables Data buffer memory This is a mode for the memory module used during ROM testing In DBM mode the memory module supplies non algorithmic data based on a address provided from the PG A process used for test program development device characterization incoming inspection and production floor troubleshooting Design for test Data generator Data g
241. compiled with the 1 11 compiler Kalos 2 User Manual 37 3 Test Program Definition Test Program Language This section provides the definitions for the Kalos Test Language KTL and Kalos Pattern Language KPL Also provided is an overview of the procedures involved in developing a test program file for the Kalos 2 memory tester Kalos Test Language KTL Kalos 2 test programs are written in the Kalos Test Language KTL This intuitive test language designed specifically for the needs of Kalos 2 memory testers is based on the ANSI C programming language There is no procedural code test flow and test sequences are encapsulated into data structures The compiled binary formatted executable version of the KTL file includes a kbi Kalos binary interface extension KTL files are created using one of the following two methods e Any ASCII text editor Kedit A Credence supplied text editor Figure 24 shows a typical KTL program file The programs that are listed on the left are optional parts that can be used in a test program run The main window shows the program header information Header information may list program information such as the device type description origin application dates etc Header lists are not required but they provide a history of the test program 38 PN 071 0359 02 October 2005 Figure 24 Ons seuss KTL File x Kedit socket 8 IO ktl E Program Ea SOCKET Ea CYCLE NAMES
242. conductor devices The timing generator Each TG ASIC provides timeset format and period memories and verniers for six tester channels The Kalos 2 contains a variable resistor with a programmable bias supply behind it This can be used to provide device loading either as a pullup or pulldown load or as a source of termination An error event that occurs after a maximum time interval for an expected event Timing set The specification of cycle length and edge placements that can be referenced collectively for up to four edges Test program executor A portion of the Kalos 2 test operating system which runs on the CPU of each Kalos 2 board To monitor the execution of a program and report the sequence of actions carried out Kalos 2 User Manual 551 A Glossary of Terms tristate TSET uRAM VCH VCL vector VIH VIL VIOH VIOL VOH VOL VT A high impedance third state for a device output Timing set The specification of cycle length and edge placements that can be referenced collectively for up to four edges Pattern controller micro RAM Voltage clamp high used to clamp the I O s high voltage Voltage clamp low used to clamp the l O s low voltage 1 A parallel vector is the functional logic applied to a DUT during one clock cycle 2 A scan vector is equivalent to a partition and uses multiple scan clock cycles See also partition Voltage input high with respect to th
243. create high pass name lt string gt sample rate double pass freq double length int Creates a high pass filter waveform with the given parameters create low pass name lt string gt sample rate double pass freq double length int Creates a low pass filter waveform with the given parameters create pulse name lt string gt rate double cycles int points int start double rise double width double fall double amp double offset double Creates a waveform consisting of pulses with the given parameters create pWeight name lt string gt sample rate double length int Creates a psophometric weighted filter for use in telecom applications create saw name string rate double cycles int points int start double rise double amp double offset lt double gt Creates a waveform consisting of sawtooth cycles with the given parameters PN 071 0359 02 October 2005 Waveform AWT Table 26 Commands recognized by AWT user command Interpreter Cont Command Meaning create sine name lt string gt cycles int length int rate double phase double amp double offset double Creates a
244. ct the zoom rectangle in the pane after choosing the View Custom Zoom menu item click and drag the left mouse button or use the Custom Zoom a toolbar icon View Options Using View menu item allows the user to pick and choose among v Cursor Bar the four Analog Wavetool components Cursors Bar Calculator v Calculator Transcript Pane and Stack Preview A check mark by the item v Transcript signifies that it will display no check mark means that it will not v Stack Preview display Online Help Online help is available by way of the Help menu item or toolbar icon Kalos 2 User Manual 217 5 KITE Utilities No System Cursors The Analog Wavetool does not provide default system cursors All cursors must be created manually and can be deleted This is done by right clicking in the Waveform Graphics pane and selecting Create New Cursor Flexible Cursor Delta Boxes To display delta information select any two cursors Cursor Pop up The cursor pop up menu features of Analog Wavetool 2 0 behaves as follows Edit gt Undo or Redo Create cursor menu item or toolbar icon is used to undo or redo create cursor Cursor menu items also include Set as left cursor and Set as right cursor to establish the delta cursor Change name to change the name of a cursor Change color to change the color of a cursor X Scale and Y Scale Each displayed waveform contains the X and Y Scale with Scale Factor selection and
245. ctories that contain files and data necessary to operate the Kalos software KITE The two primary subdirectories are C Kalos and C KalosOS These files are located on the C drive C Kalos Directory The C Kalos directory contains subdirectories that include files and data that have traditional locations that users must be aware of The primary subdirectory is the bin subdirectory The bin directory contains the executables as well as all the calibration and diagnostic routines that are run on Kalos 2 test systems By default files are saved to this subdirectory location unless otherwise specified i e summary files of a calibration run The doc subdirectory located off of the Kalos directory contains pdf files which contain the documents used in the help files as well as the user applications changes etc The Kalos Test DevicelF subdirectory contains the driver files as well as the production ini files The production ini files contain the settings for prober drivers The Data Engine and custom GUls are currently applications supported hardware This directory structure is shown in Figure 20 26 PN 071 0359 02 October 2005 Figure 20 Kalos2 Directory File Edit View Favorites Tools Help Q sax Q y JO search lie Folders Address C 1Kalos2 Folders X Name C BIF PROM FILES Dbackup 8 O dell ECaldiag E C3 Documents and Settings Dcaldiag960 emu debug e Bonu 8 backup include C Caldiag Qkmo
246. cution number that is how many times the program was executed and the vertical axis depicts the individual test suites Each matrix square is color coded to depict its test status A green box indicates the test has completed execution and passed A gray box represents a test in the sequence that has not been executed A red box indicates a completed test that failed Kalos 2 User Manual 193 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 125 Matrix Chart Test suite name Slice and channel summaries are displayed in Figure 126 194 PN 071 0359 02 October 2005 Running System Diagnostics Figure 126 Slice and Channel Summaries Mad LASCIA CIAR S PHPPPPPPPP Channel summary Calibration Diagnostic Tool Icons A description of the tool icons located at the top of the Calibration Diagnostic window as shown in Figure 127 follows Kalos 2 User Manual 195 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 127 Tool Icons Paste Print Step E Colors Open file n Pause a Abort About Calibration Diagnostics Slice Summary 7 File Edit View Options Execute Window Help S 6 Mm n i 8 y Flow Print Options Slices Cut Copy Colors About El I Datalog Summary SAY ane Results To de Frana free i NPA A 1 Expand 1 Summary Channel Clear Tree Auto Summary Results Scroll 3 D Close Datalag aan os Summary Tree E pom Open file Brings up a
247. d FLOW is selected on the target 10 If a Kalos Project file was loaded file name with extension kpj and the associated deviceif keyword defines a prober or handler DLL the specified DLL is loaded on the Host PC NOTE Test program loading will fail if the full path name of any loaded file exceeds 100 characters in length Kalos 2 User Manual 107 4 Introduction to KITE Kalos 2 Integrated Test Environment Front Panel Interface The System Front Panel is an interface between the Windows XP workstation and the Kalos 2 test system see Figure 71 The Front Panel application is the main interface of KITE and serves as a viewer for directing exploring and altering environmental and operational functions These functions include all normal operations required for the user to run a test program including program management The Front Panel is used to access the system diagnostic programs and the system calibration programs To invoke the Front Panel graphical user interface GUI double click the Front Panel icon Shortcut to FrntPanel icon located on the desktop or through the Kalos Configuration Manager application 4 Double click The Front Panel provides the main user interface to the tester hardware The System Front Panel application provides the setup functions for device testing One of its functions includes loading of device programs It is from Front Panel that test programs are loaded and executed a
248. d highlighted The Paste selection will paste whatever is in the clipboard at the insertion point cursor position The Resource Completion feature allows the user to see existing resources e g CONFIGs FLOW etc For example as shown in Figure 41 by typing in FLOW the existing flows appear in a pop up that can be entered by selecting the desired option NOTE This feature is activated only for test programs opened as a workspace 72 PN 071 0359 02 October 2005 Figure 41 View Existing FLOW Files Kedit Bl xl class prog 4 f SOCKET Za CYCLE N EL CMODULE f PINGROU EL CONSTAN EL VARIABLI f DPSSET f PMUTEST To LEVELS fa TSET TAI Za FSET TAI Za PSET TAI Za CYCLE T f TIMING de Ma AXIS To sHMOD fa VLOG f PATTERN f LOADDBM a O Trair Trair e Trair Trair EVENT MZ T gt H f SEQUENCI FLOW fa TEST FLOW zu FLOW INIT CONFIG chkrbd no DGSET FLOW Training Test Flowl INIT INIT 2 InputLeakageLow InputLeakageHigh OutputLeakageLow OutputLeakageHigh Isb CMOS Test Isb TTL Test ICC Test Chip Erase verify Array read ff wet rdCKBDO alu wrt rdCKBDf alu wet rdCKBD55 import wrt rd subroutine polling d bof wrt rdSTRIPES mask ecr example 17 4d ATREA ERAN ARA ERAN RAR
249. d then halts the test program The Resume button continues from the pause location Summary The Summary property page shown in Figure 83 provides an interface for getting current summaries using either a text table format or graphical displays such as bar or pie graphs for the selected Kalos 2 slices Summary information includes the header of the current test program totals for number of devices tested number passed and number failed as well as a breakdown of the binning categories Basic features of the Summary property page include Summary Kalos 2 formatted text table and multi lot summaries with Kalos 2 slice selections for individual and or composite summary viewing Bin summaries graphical bar charts for sort soft and functional bins FBins for online lot displays only Kalos 2 slice selections are also available see Figure 84 126 PN 071 0359 02 October 2005 KITE Software Figure 83 Summary Property Page Text Sums system Front Panel File View Options Utilities Tools Help Jj Co 21M Y 8 0 0 boe s EGO wl v se Com Kar aeredenn credence Action FR Soft Keys FK1 FK2 FK3 FK4 FK5 FKG FK7 FK8 FK9 FK10 FK11 FK12 FK13 FK14 FK15 FK16 Active Slices Bank Active Slices Bank B Active Slices Bank C Active Slices Bani Engineering All Summary Summary Slices Bank A Summary Slices Bank B Summary Slices Bank C Summary Slices Bank D cr E st
250. d Mem Write0 bin File name TestBint 01 bin Files of type Kalos Datalog Binary bin y Cancel 1 360 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine Production Engineering Modes Production and engineering modes are very similar Depending on the current mode MIR MODE COD field in STDF gets P and E Production Engineering values respectively In production mode the settings dialog is locked out Selection of Production Engineering modes is performed by the NT PROD NAME key in the DATA ENGINE section of the kalos production ini When the user login name specified matches the current user production mode is selected otherwise engineering mode is selected Disabling File Generation for Specified Flow It is possible to disable enable file generation for a specified flow by changing the KPJ file All flows are enabled by default Change de output general to set the general setting for all flows for that configuration value can be disabled or enabled Making this change by name of flow overrides the general setting value can be de output disabled or de output enabled In the following example Check Chip1 flow flow generates files that other flows will not generate General 1 Socket single 1 config singlel conf subdir general 1 de output general disabled Check Chipl flow de output enabled Test Program Loading After Dlog Engine Startup If the test program is
251. d including the selected test then waits for the user to click on the Start or Stop button or launch Kalos 2 application debugging tools such as Shmoo Test Debugger and ShowBitz If the user executes a shmoo plot every data point on the plot is the result of running the selected breaktrap measurement The Test Debugger tool reads the current test components and allows viewing and modification of them ShowBitz displays and allows modification of the contents of all hardware registers in the Kalos 2 system Refer to the Test Debugger chapter in this manual for additional information on break test settings DBM SRAM Viewer in Front Panel All DBM and LVM data in a test program is stored in the tester DRAM At program load time the SRAM contains the last data loaded into it in the order it occurs in the test program At test program runtime the SRAM is updated from the DRAM by the test program itself when a DBM or pattern resource name occurs as a SEQUENCE action The Redundancy Analysis function may also save and restore the SRAM from DRAM The smallest unit of storage used in the DRAM is one row which is 288 bits of data The SRAM is also composed of rows of 288 bits of data When the DUT width is a power of 2 from 1 to 32 only the first 256 bits of data in a row are used The upper 32 bits of these rows are ignored NOTE Although each DRAM entry has a fixed and re locatable component at times the fixed component may be used for re l
252. d pu Destination buffer for functional test test pattern name mt po Kx get num TestNo S through Return Value Function Name Description Parameters tesiNodemfo J kdx getlndexed test All test execution info int idx Nodelnfo EN int site 1 Gets results of n Pointer to parametric kax gst parameirie parametric test test results structure data 3 execution vod rT Gets results of R Pointer to functional e functional test test results structure execution void po Kalos 2 User Manual 403 5 KITE Utilities Pointer to shmoo kdx get shmoo hea Gets buffered shmoo ShmooHeader header data structure Gets buffered data for Pointer to structure of one line in shmoo ShmooData data for one line in graph Next call shmoo graph retums next line data Example Code Listing kdx get shmoo data The code example below creates a custom DLL wafer summary dll for hardware bins summary file generation at the end of wafer For example Tester ID KALOS VAGHINAK Tester Type Kalos48 Interface TEL P8 Date 06 Aug 2002 15 54 22 Program A5CO Device A5CO Flow s00 lews k Lot A219568 Wafer ID A219568 25G6 Wafer Num 025 Operator Vaghinak User Text comment Users C user message Site CREDENCE US Tested 1062 Passed 820 77 21 Failed 242 22 79 Categories Sort Name K00 K01 K02 K03 Totals Percent 00P Bin good 91
253. data Export dbi Allows exporting of a dbi file with the current application status and conditions 340 PN 071 0359 02 October 2005 Get DBM Data HW Set DBM Data HW Print Print Preview Print Setup Exit DBM Editor DBMEDIT Get current DBM data from the specified Kalos slice and its respective hardware Send to the specified Kalos SRAM hardware Note if in Simulation Mode data has a maximum length of 256K Print allows the user to schedule a print hardcopy operation for the selected DBM pattern Allows reviewing of the data before the Print operation is invoked Setups formatting and path control for the Print operation Closes the DBM Editor utility and all associated windows The toolbar is an arrangement of graphical buttons clustered by functional groups that when clicked send messages as do menus and keyboard accelerators for requested functions of the DBMEdit utility see Figure 202 Figure 202 Toolbar File Utilities Tools Help Sa el ajaj DO O OO AA D er es Import dbi same as the above File menu definition Export dbi same as the above File menu definition Print same as the above File menu definition Get DBM Data HW same as the above File menu definition Set DBM Data HW same as the above File menu definition About displays software version information Kalos 2 User Manual 341 5 KITE Utilities Property Pa
254. dbyHllcc VCCO MEAS PMU 170 PN 071 0359 02 October 2005 Breaktrap Settings In Example 2 on page 173 the execution of the Read CKBD all test implies execution of VCC 5V VPP OV Levels Read READ FF STATE cycle table1 read CKBD PG RUN PG STOP Measurement 1 A measurement taken on one of the power supplies or the parametric measurement unit MEAS VCCO I VCC1 I VPPO I VPP1 I PMU or 2 The execution of a pattern burst PG RUN In Example 1 on page 172 execution of the Measurement in the IccStandbyHi test is the execution of the MEAS PMU command In Example 2 on page 173 execution of the Measurement in Read CKBD all test is the execution of the PG RUN command FAIL FAIL is defined as a fail of a measurement Note There could be more than one measurement in a test SEQUENCE Step Step is to sequentially execute every command line resource statement action C function in its SEQUENCE upon pressing the Start button To enable the Step Breaktrap Setting the Pause button must first be selected Examples The following device test program examples are provided in order to illustrate and step the user through setting up and executing the following BreakMeas Breaktrap Setting BreakFail Breaktrap Setting LoopTest Breaktrap Setting LoopMeas Breaktrap Setting Pause Breaktrap Setting Kalos 2 User Manual 171 4 Introduction to KITE Kalos 2 Integrated Test Environment Test
255. ddition each backplane in the test head contains an IDROM Each IDROM contains formatted data identifying the manufacturer of the hardware and its capabilities This information is programmed into the IDROM during the manufacture of the hardware Each time the Kalos 2 test system is initialized the IDROM data is retrieved and made available to all Kalos 2 boards and software This information is used by Kalos 2 software to determine how to best utilize the hardware The Idrom utility is launched by clicking on the DRom icon see Figure 221 or it can be selected launched from the Utilities menu item For additional information on the Idrom utility refer to the Idrom section of the Introduction to KITE chapter of this manual Figure 221 IDRom Icon Click here to open the IDRom utility HE Hs JE 1 Kalos 2 User Manual 415 5 KITE Utilities NVMDIB The Non Volatile Memory NVM on the Device Interface Board DIB is a small memory located on the test hardware that contains identification and configuration information needed by the test program NVMDIB is the readback of the current device interface board IDROMs if the user has implemented them Detailed information on the NVMDIB utility is provided in the NVM User s Guide located under the Help menu of the NVMDIB utility The NVMDIB has no relationship to the DIB Info 416 PN 071 0359 02 October 2005 System Monitor System Monitor The System Mo
256. ddress Counter Subroutine Stack Address Repeat Counter Loop Counters 0 1 2 3 Match Counter Cycle Counter Refresh Counter Logic Address M N Logic Data M N LVM Address LVM Cycle Counter er When trigger first instruction is selected trigger occurs on the first cycle otherwise trigger occurs when all enabled trigger conditions are true The following resources can be used to set the condition or conditions for trigger Uram Address Counter Subroutine Stack Address Repeat Counter Loop Counters 0 1 2 3 Match Counter Cycle Counter Refresh Counter Logic Address M N Logic Data M N LVM Address LVM Cycle Counter 162 PN 071 0359 02 October 2005 Synchronized Fail History RAM Control The History RAM default settings are shown in Figure 104 Figure 104 History Ram Control Default Settings E3 History Ram Control St ora g e mo d e Cycles Other pama l j selection Before Arm amp Trig oO f9 Arm First Instruction Trigger on Fail A check After Arm amp Trig Trigger First Instruction indicates Arm Condition Trigger Condition the selection NAG NAg a SES vo Uu Re Mi ORUM Gene ANNA a a a AA AK Au Ad aaa a RET Get Settings Save Settings AA ANN TN IN a E QI ERE ee ma AN a OR Ji CER QI ETE AK NAKO Aangann US CER NOTE The settings that are chosen within the History Ram Control popup window affect whatever pattern is currently loaded
257. dicate the currently selected channels Click the left right spin buttons at the top of the dialog to view to the desired channel range Check uncheck the check boxes to select the desired channels The Selected Channels field shows the selected channels Type the desired channel numbers and or pin group names in the Enter channels pin names groups field and click the Select button to check the corresponding check boxes and to display the data of the selected channels in the LDTool window Click the Sort by number button to show the selected channels in the LDTool window sorted by their numbers Click the Show VCD button to show all channels in the LDTool window in the same order as defined in the pattern file Click Show All to show all channels 0 767 sorted by their numbers Click Hide All to hide all channels in the LDTool window 306 PN 071 0359 02 October 2005 Logic Debug Tool Waveform Window This window shows the data presented in the LDTool window by means of waveforms Figure 174 WaveForm Window Logic Debug Tool File Action Edit Yiew Options Help cpjao z Address Vector ID Tset Repeat STV SYNC IGNF Pass Fail Period Scale CI 25 50 25 50 25 50 25 50 25 50 25 50 CHO CH1 CH2 CH3 CH4 CH5 CHE CH lo slo s o s o s o o o o CH8 lt LDTool WaveForm LATool DSTool Datalog Ready VCD 96x4 O
258. directly to the Kalos 2 datalog stream This is illustrated in Figure 216 Figure 216 Datalog Architecture in Kalos 2 Software Data From Prober DLLs DE receives information from prober DLL through datalog that includes 374 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine e Lot name e Wafer name Disposition of the devices on the wafer e Wafer geometry It also receives information about major process events e Start wafer End wafer End lot Use of Runtime Decode Strings and STDF ini The intent of runtime decode strings is to pass values of custom defined variables to DE from any application integrated with Kalos 2 core software They are passed as a structure STATIC LOOKUP UMSG that has two strings e Key identifier of variable e Value of variable Values for these variables can be received and used by the DE and its DLLs To use this feature from custom DLLs refer to Runtime Decode String Functions This method is used to fill in applicable STDF fields Some prober DLLs perform runtime decode string generation which is passed to Data Engine for several STDF fields Dlog Engine includes that function and does not require such DLLs Data is read for sending from the STDF ini file Parsing is performed at program loading STDF ini must reside in the same directory as the KBI file Refer to the sample of STDF ini in the Test data_engine directory of the DE install Each section of that fil
259. display of the current wafer sorting action with an instant summary of the executing wafer The viewing area of the Wafermap window is under user control for defining which optional views are active By default the draw area shows a single wafer graphical view of the sorting criteria whereas the control area displays the current die coordinates the die pass fail status and the current running summary including the count and percentage of sorted die of the wafer During this process the prober supplies the x and y coordinates of the die with the tester suppling the pass fail sort and soft bins to the application Kalos 2 User Manual 141 4 Introduction to KITE Kalos 2 Integrated Test Environment The automatic mode causes the Wafermap to become a slave application to the tester and selected device program This means the user has control from their device program for determining the sort criteria for the pass fail decisions whereas the tester supplies the start test end of test and the individual wafer summary to the feature Interactive Wafermap Interactive Wafermap allows users to interact with problem wafers for example low or zero yield or excessive fails Interactive Wafermap provides control of the prober to move over and pause on a particular die for further examination click on the die to stop production Three conditions must be met in order to use Interactive Wafermap 1 The ini file must have PP INTERACTWMAP e
260. down menu controls that include File Edit View Selects Utilities Tools The following and Help describes each item on the menu bar File Pulldown menu includes Export Setups Saves all current setups Import Setups Print Erases the current setups then reads the setups of the selected file into the application Schedules a print hard copy or write file operation for the current shmoo plot screen Output is an ASCII data printout or file 454 PN 071 0359 02 October 2005 Shmoo Tool Print Preview Displays a screen view of how the file will look once it is printed allowing the user to review the data before invoking the Print operation Print Setup Allows setup formatting and path control of the print operation Shmoo shm Open File Opens shm shmoo file extension file for saving shmoo plots Save to File Option to manually save the current completed shmoo plot to the Open shm file Auto Save to Open File Sets automatic save at the completion of each shmoo plot Composite acc Open File Opens acc composite shmoo file extension file for saving a Composite Shmoo plot User controlled save is the only option available Save to File Option to manually save the current Composite Shmoo plot to the Open acc file Exit Closes the Shmoo tool and any associated windows Edit Pulldown menu The Edit pulldown menu contains a list of setup edit commands These are available on
261. dress edit box and click Goto to jump to it Go to what Enter Vector ID 1 312 ie dcus O in the pes Adi B o what list then you can specify Goto the desired Vector ID in the Enter Fail Vector ID edit box and click Goto to jump to it For more options click the More button to display additional options for advanced fail survey Loop Fails if checked allows fe Newt looping back to the first last fail ee rer upon reaching the last first fail When this dial Padus ueri dd Previous while stepping through the fixed Shift F4 to go to the next fails and previous fails More First Fail jumps to the first fail Last Fail jumps to the last fail If Fail is selected in the Go to Next what list then the Goto button When this dialog is turns to Next button If any fail is inactive use F4 and _ Previous fixed the Next and Previous Shift F4 to go to the next S Tess co buttons will become active Use these buttons to jump to the next or V Loop Fails First Fail previous address with fixed fail Last Fail Kalos 2 User Manual 337 5 KITE Utilities In all cases the LDTool window scrolls and brings the address with the fixed fail to its top LDTool Menu LDTool provides the following menu File Action Edit View Options Help File menu items Save Exit Action menu items Onlinexoffline Get Vector Data Set Vector Data Run Pattern Stop
262. dures involved in developing a test program file for the Kalos 2 memory tester Instructions are provided for using the Kedit utility a Kalos supplied text editor used to generate edit and compile test programs Introduction to KITE introduction to KITE software The functions of the Front Panel which serves as a graphical front end to load and control execution of test programs are described Instructions on how to prepare a device for test load a test program and test the device once test system preparations are completed are provided Also included are basic calibration and diagnostics procedures KITE utilities describes each KITE utility and provides information on function and usage Test Debugger introduction to the Test Debugger application Information is provided on this interactive utility that allows the user to modify test program components including flow sockets tests levels and timing data within a Kalos 2 test program Shmoo and Bitmap tools an operational description of the Shmoo tool which includes Pin Monitor and Value Log The shmoo is used to characterize various parameters of the device under test by creating a graphic display of the relationship between defined parameters over a range of values The Bitmap tool provides multiple operational modes These operations include online and offline interactions The Bitmap viewer displays current online cell address failures of the device under test This incl
263. e Properties t5 Zip and E Mail Kedit zip E knet960 out 9 knet dll E knet lib Plkpc exe E kpc ilk e KServer exe La ksim exe E ksim out kspawn exe 8 KSrvrApi dll E KSrvr pi lib kc exe Flyfu exe 3 make kalos S makeComp bat E makeComp tcl 5 Nm dll E Nym lib Fpbidump exe Bpmon exe E psapi lib EJ ra out e register chm E rq dat e safety exe TBugger exe si safety lib telnet exe G0 safety pdf E tpe out s sbanc dll 5 sbanc lib E sbcom dll E sbcom lib a sbiz out C2 sbiz ttf 8 sbpa dll sbpg lib 55 sbtg dll E sbtg lib f scan wave dia 8 send dll s send lib fi shmoo exe a shortcut to Kedit exe Pagi showbitz exe E showbitz lib El showBitz pdf P shsh exe sierra exe E signatures dat 55 stc10 dll ti stc10 lib taraetmar exe All The created shortcut Once the shortcut is created click and hold the shortcut icon using the right mouse button While holding down the right mouse button drag the icon to the background area where you want it to reside To launch the application or file double click the left mouse button on the shortcut icon 32 PN 071 0359 02 October 2005 Software Architecture Launching Applications There are two ways to launch an application when using Windows XP
264. e contains values for STDF record with the same name Users can enter information into required fields for generating STDF files by writing values in STDF ini Refer to the following example ATR cmd line MIR job nam job_rev sblot_id B oper nam node nam etc Kalos 2 User Manual 375 5 KITE Utilities Test Program Modifications for Data Collection Modifications include switching datalog on off selective datalog file generation storing ASCII strings in the datalog files putting C Hook computed data into the datalog files and assigning a unique test number to each test Switch Datalog Files Generation On Off It is typically necessary to generate datalog data for every test in the test flow in the production environment In this case datalog must be switched on at the very start of the test program This can be accomplished by using the KTL EVENT MAP EVENT MAP generic STARTLOT Start lot STARTWFR start wafer STARTTEST start test ENDTEST save dies bin ENDWFR save end of wafer ENDLOT save end of wafer y For this purpose STARTTEST event is used in the EVENT_MAP TEST start test SEQUENCE dlog on y The start_test executes a C Hook that must be defined in a separate C file In this example the following C file is named datalog c datalog c C module include lt chook h gt RESULT dlog on void f
265. e DUT This term in context of the tester refers to the drivers output when high Voltage input low with respect to the DUT This term in context of the tester refers to the drivers output when low Voltage current output high This term defines the voltage to produce the current for the active load when the DUT is high Voltage Current output low This term defines the voltage to produce the current for the active load when the DUT is low Voltage output high with respect to the DUT This term in context of the tester refers to the comparators input when comparing for highs Voltage output low with respect to the DUT This term in context of the tester refers to the comparators input when comparing for lows Voltage threshold used to determine the switch voltage point for the active load 552 PN 071 0359 02 October 2005 wafer wafer map waveform workstation computer Y yield Z ZIF A thin polished slice of monolithic semiconductor on which an array of die are fabricated A plot of the viable dice on a wafer showing pass fail information parameter variation or some other characteristic The succession of signal levels applied to the DUT pin after combining pattern and timing information The computer located in the Kalos 2 power server which runs the Windows XP operating system and the front end portion of the Kalos operating system The proportion of good devices in a lot or run Z
266. e Esc key also cancels the dialog A few additional tips Kalos 2 User Manual 221 5 KITE Utilities Parameter Input dialogs remember values from one call to the next If a value is set in a dialog box and the same function is performed again the same dialog box comes up with the values last accepted The exceptions to this are the names of waveforms and cursors New default names are generated each time the function is accepted Pressing Ctrl a selects the entire parameter Pressing Ctrl h backspaces and deletes the previous character Setting Options To specify preferences for items shown in the Options window see Figure 140 1 2 3 4 Choose the menu item Tools Options Click the tab that corresponds to the item you wish to set Adjust settings Click OK Figure 140 Options Window Display Preferences Default Locations Drawing Style Sample Mode Display Mode User Units Graticule Color Graticule s all Marker Color M Synchronize X Axes Display Background Color J Y Cycle Waveform Colors Synchronize Y Axes v Display Stack Topdown Y Synchronize on Scroll Drawing Accuracy Best Display Display 5 Waveforms Max OK Cancel Help To choose options for display 222 PN 071 0359 02 October 2005 Waveform AWT Select the Display tab from the Options window Drawing Style There are four waveform Drawing Styles in the Opti
267. e LOOP Exp Act 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 Test Mdl Site PS Test Description Cycle Count CntrA 0x Z Y X CntrB 0x Z Y X CntrC 0x Z Y X Pass Fail 810 00 01 erase LOOP 0x00000000 0x00 0000 0000 0x00 0000 0000 0x00 0000 0000 PASS Test 900 00 01 wrt55 Test Test 950 00 01 wrt55 LOOP Test 1000 00 01 read55 Test Test 1100 00 01 read55 LOOP 150 PN 071 0359 02 October 2005 Yield Monitor KITE Software Yield Monitor provides an option to stop yield the test after a specified pass fail percentage or bin count is reached on each Kalos 2 slice This option can be used during production to monitor yield and stop the test if failures or bin counts go beyond a predefined percentage For example if the probe card develops an open pin Yield Monitor can be configured to stop the test before the entire lot is tested see Figure 98 The following setting options are available on the Yield Monitor property page Monitor Type Sample Size Greater Module Tested Pass Count Fail Count Failed 96 Greater than Failed 96 Disabled Enabled Toggles to turn Yield Monitor off on Pass Fail Percent Select to stop test based on total yield failures of tester or module next two buttons Bin Counts Select to stop test based on total failures of a particular bin In Kalos versions 1 8 8 and higher this can be selected for the Tester only not per module Select to sampl
268. e a constant by the top waveform on the stack div wf const const double Divide the top waveform on the stack by a constant drawing style line point sample hist Set the drawing style to line point sample mode or histogram Kalos 2 User Manual 289 5 KITE Utilities Table 26 Commands recognized by AWT user command Interpreter Cont Command Meaning eff bits full scale double fconv double phconv double Determine the effective bits of the top of stack waveform based on the parameters given fft ni Find the Fast Fourier Transform of the top waveform on the stack find level string double rising falling either Cause the named cursor to find the indicated level on a rising falling or either rising or falling edge graticule cartesian grid scale off Select the graticule type Cartesian grid scale or off histogram type normal Generate a histogram of the TOS waveform Size weighted must be a power of two size int ifft Find the Inverse Fast Fourier Transform of the top waveform on the stack inl dnl ramp segs int bits int ramps int mag double vref z double offset double Find Integral and Differential Non Linearity of the top of stack waveform based on the given parameters
269. e and anything below it as a failed datapoint Its view has a status zero pass less than the value and equal or greater than the value Percentage view is displayed by values of ten 470 PN 071 0359 02 October 2005 Setting Up the Shmoo Plot Figure 259 Composites Property Page j Shmoo Application File Edit Utilities Tools Help elle Shmoo Application Messages Online Operations Online is the normal operational mode In this mode the software interacts with the tester hardware Tests programmed by the user supply the pass fail criteria and system resource setups ASCII or Screen Print Operations Shmoo plots may be output to a printer or file in ASCII or color hard copy Color hard copy may include the entire Shmoo Application window or a specified region of the window For color copies use Ctrl Alt Print Screen to save the output to the clipboard A third party software application e g Paint must be used to paste the content of the clipboard then print the color copy to a printer Kalos 2 User Manual 471 7 Shmoo and Bitmap Tools One Dimensional Shmoo Plot The 1 D Shmoo consists of a selected variable setup executed across a specified range with the resulting pass fail region displayed as a one line plot along the X axis Options include selected pass datapoint skipping and all accumulation modes Including the original datapoint the minimum number of datapoints in the axis direct
270. e any of the slices by clicking on them If there is only one slice enabled it cannot be de selected i e one slice must be enabled Slices can be enabled or disabled on the Overview and Engineering property pages Any slice s brought up after Front Panel is launched will display as disabled Any board in the system can be selected or de selected by clicking its corresponding button on this screen Slices begin with slice AO Bank A Slice 1 and display up to D72 Bank D Slice 18 116 PN 071 0359 02 October 2005 KITE Software NOTE Once a program is loaded slices that have a valid program load appear blue Any that do not have a valid program appear red Overview The Overview property page displays the current system configuration as well as all available hardware and software configurations It is divided into functional areas Kalos 2 Active Slices Header Configuration Status FP Datalog DLogServer Monitor and Device IF and Sort Bin Results as shown in Figure 76 Figure 76 Overview Property Page The Header area displays header information for the current test program The first field labeled Program contains the test program file name which is read in at load time The remaining fields contain descriptions and comments which are optionally input by the user Once a test program is loaded the user may select any flow in the loaded test program by clicking on the Flow field Clicking in the window disp
271. e applicable step button located on the toolbar of the editor to step to the line of code that will run the loaded test pattern At this point the Start KPL Debug button located on the debug section of the toolbar see Figure 49 will highlight To start KPL debugging click the Start KPL Debugging button The source file of the currently loaded pattern is displayed and KPL debugging resources are enabled Place the cursor on the first line of code in the pattern file You will notice that there is now a new window loaded at the bottom of the editor see Figure 50 Kalos 2 User Manual 81 3 Test Program Definition Figure 49 Start KPL Debugging wu Kedit verify_kedit ktl fx FS File Edit View Compile Tools Options Window Help l x verify kedit Dum a ee eee 3C 27 5 c En TS eee ae z include deb kedit dule h 5 nee tre UE E tec Start KPL Debugging TEST step into SEQUENCE c step into c step 3 Figure 50 KPL Debugging Resources Kedit fc debupper Ta PLNGR U ADR eu com e com cam com ows e ows peus gr inv Y constar a Ba VARIABL fa pssst f emvrest w Ea Levens Ta TSET_TA fa rset TK Sa PsET TA f crcux T Pa TIMING a acs Sa nao gt a exkpl 2 uPRORLO Start KPL button Cursor is Initially placed here O0x00f cga cmp x X ADDRESS MAX cga mask y 20x00f cga_mas
272. e are 10 A cable for AC input wiring is provided for each Kalos 2 shipped A 4 wire cable is used for a US version or countries using 3 phase 220 VAC A 5 wires cable is used for European countries or countries using 3 phase 380 VAC Kalos 2 User Manual 15 1 Kalos 2 Hardware Configuration Host PC The host computer one per system is a 2 4 GHz Intel Xeon processor Pentium 4 based PC and runs under the Windows XP Professional operating system see Figure 13 It uses a high resolution monitor 1600x1200 with a CD RW drive 48x 24x 48x It also loads with Kalos 2 software for testing The host PC is readily networkable to a local networking link using a standard 100 Base TX Ethernet port to and from the test head that is used to communicate with the 72 ETX controllers in the Kalos 2 test head An external 10 BaseT 100 Base TX Ethernet port is used by the host PC to ensure that the Kalos 2 test system is readily networkable to a local networking link The host PC has a 36 GB Ultra 320 SCSI hard drive The serial parallel and USB ports of the PC link to the backplane for Internal Board Monitor IBM communication A GPIB external port is also included for communication between the Kalos 2 system and a prober or handler An optional second PC can be added as the data server of Kalos 2 systems Figure 13 Host Computer 16 PN 071 0359 02 October 2005 Main Board Main Board The Kalos 2 main board hardware configurat
273. e pulse well after the signal has settled The user is prompted for the following parameters Stable Period the amount of time the signal must remain within the range to be considered stable Level Averaging Period amount of time before the second cursor location over which to average the signal to determine the stable value of the pulse Allowed Delta the size of the range of values for which the signal can be considered settled The values at the first and second cursors of the waveform determine if the edge is a rising or falling edge The first cursor value must be less than the second cursor value for rising edges and vice versa for falling edges This function does no interpolation It works directly with the data points from the waveform Therefore the results are always a multiple of the sample interval and may not be as accurate as with other pulse functions Note Settling times of zero print neither a result nor an error message Zero settling times occur for perfect waveforms such as those created by waveform creation routines 272 PN 071 0359 02 October 2005 Waveform AWT Table 22 Pulse Function Descriptions Cont Menu Item Serial to Parallel Function This function converts a serial pulse train into a series of parallel words The TOS waveform is sampled at a specified rate starting from a given offset At each sample point the waveform amplitude is compared
274. e search routine as the LINEAR search except that it only displays the last pass point and value at the last pass fail boundary 2 D Shmoo setting causes the shmoo plot to be generated in two dimensions along the X and Y axes Both the X Select and Y Select variable setups are active Normal Pass Fail Shmoo Causes the fail datapoints of the generated shmoo plot to be represented by a red colored datapoint No interpretation of the fail data is performed Kalos 2 User Manual 461 7 Shmoo and Bitmap Tools PMU Plot XY plot of PMU Forced variable YAxis only versus the measured value XAxis Also checks that breaktraps test has initial conditions Engineering units and FVMI FIMV equal to the forced variable Note Only one PMU variable per setup is allowed If multi pins are to be measured then there must be a pre defined pingroup for that selection DPS IMEAS Plot XY plot of DPS forced variable YAxis only versus the measured value XAxis 3 D Shmoo This setting causes the shmoo plot to be generated in three dimensions along the X Y versus Z axes When this option is chosen the sweep condition sweep for fail or pass for the Z axis variable setup is selected Fail to Pass Sweep Enables execution of the Z axis sweep condition until a pass datapoint is detected Pass to Fail Sweep Enables execution of the Z axis sweep condition until a fail datapoint is detected Axis Selects Axis Selects provides informati
275. e specified is used If a different log file is currently open it is closed before the new file is opened script off Turn output to the log file off and closes the log file segment start double stop lt double gt Extract a section from the TOS waveform The start value is the time index of the first sample from the TOS waveform to include in the extracted waveform The stop value is the time index of the last sample from the TOS waveform to include in the extracted waveform serial to parallel resample start double resample rate double resample threshold double Isb msb first number bits int display tscript waveform both TBD set int display color default 1 32 Set the color of the indicated waveform to the indicated value set int display y center double Set the indicated waveform such that the indicated value is at the center of the display patch set int display y pan double Set the top of the indicated waveform to be the indicated percentage of the waveform set int display y scale double Set the Y scale factor of the indicated waveform to the indicated value set int super on off Turn superimpose on or off for the indicated waveform set int wave component value real imag mag phase Select the waveform compon
276. e test head cover and press the Power Lock Switch OFF Compressed air is ported to provide the pressure necessary for the pneumatically driven motor to close the test head See Figure 6 and Figure 7 Figure 6 Control Air Schematic MM SUPPLY MOTOR PILOT Kalos 2 User Manual 1 Kalos 2 Hardware Configuration Figure 7 Test Head Opening Mechanism Test Head Power Shutoff Switch Each half of the test head has an interlock switch or cam switch used to shut down the test head power These switches are in series with the test head push button located on backplane boards 0 and 3 Two din connectors DB25 with two pins on the rear of the power rack located on the server are used to connect the interlock switches located on the test head to the remote enable from the power supplies rack on the server See Figure 8 10 PN 071 0359 02 October 2005 Kalos 2 Test Head Figure 8 Power Shutoff Switch ERR WAN UD nm Cam switch Tester Cooling Kalos 2 test systems use forced air to cool the test head The test head comprises six axial fans that are configured into two groups of three fans each see Figure 9 Two sensors located on each side of the tester control the speed of each fan The air intake is at the sides of the test head This forces the air up through the test head where the Kalos 2 96 pin memory boards are lo
277. e test program file are All the information necessary to verify the test program matches the Kalos software used to load it Tester configuration required by this test program e Names of all files required to be loaded on the Kalos 2 target processor in order for the test program to run All of the test program files that may be required by a particular test program are shown in Figure 70 Figure 70 Test Program Load Process Kalos 2 master Ethernet slice interface Test program runtime image The following sequence of actions take place at program load time The types of files and related KTL resources involved at each step are noted Each step is performed on all tester targets selected for the load program operation 1 Delete current test program on target The last loaded test program is deleted on the target in preparation for loading the next test program As long as no configuration change occurs such as going from a 48 channel to 96 channel DUT width the contents of files previously loaded to the DRAM remain unchanged 2 Unload CMODULEs or clibrary files C object modules with the extension o that were loaded for the previously loaded test program 3 Process Kalos revision number which terminates the load process if the test program is out of date with Kalos software being used to load it 106 PN 071 0359 02 October 2005 Loading Test Programs Projects in KITE 4 Process test configuration
278. e text field Allows for modification of all DPS and PMU modes and values by either selecting an element from a pulldown list or by editing the test field Shmoo and Valuelog setup tables and expression sequence editors Allows for modification of setup values by editing the respective text field white area only Constants and Variables allows for modification of variable values or expressions by editing the respective text field white areas only Also displays the constants and their respective values however modifications to these areas are not allowed Displays NVM loadboard data pattern statement fail modes which can be changed by way of the Patterns tab and waveform AWT statement 424 PN 071 0359 02 October 2005 Test Debugger Application Primary Window Overview Functions The following is a description of features contained within the main Test Debugger Application window See Figure 227 for locations 1 2 Application control button Enables Windows pulldown menu for Test Debugger Application controls Restore Returns to the previous applications window condition Move Allows screen positioning of the application window Size Enables resizing of the applications window Minimize Icons the application and closes associated windows Maximize Enlarges the application window to its maximum size Close Shuts down the application and all associated windows Title bar NOT
279. e throughout all phases of Kalos 2 development for debugging hardware run time software diagnostics GUI tools and test programs Because ShowBitz is not bound by the methodology of any test program it can perform functions that cannot be performed any other way For detailed information on using the ShowBitz utility click on the ShowBitz utility He p button and select Reference Manual The ShowBitz utility is launched by clicking on the ShowBitz icon see Figure 219 or it can be selected launched from the Utilities menu item Figure 219 ShowBitz Icon Click here to open the ShowBitz utility TF e ARO SA Ea ShowBitz Interface The ShowBits interface main window is shown in Figure 220 The ShowBitz utility comprises the following parts e Navigator Kalos 2 User Manual 411 5 KITE Utilities Channel Views Omni Views Slice Views Register Views Protected Views e Shortcuts Views e Toolbars Send View Message Window Figure 220 ShowBitz Interface Window lt ShowBitz Stop Start at Uram o Loop rT History Ram Setup Mode Sture Al Stop Diy Cycle 00000000 md Fr pr Pass Fail Results Bibs SETE F Opbors History Ram 3 Pars Md wew TG Vector PassFal View Hessagesn 412 PN 071 0359 02 October 2005 ShowBitz Utility Navigator The navigator is the first window that appears when the ShowBitz application is launched An overview of the
280. e tool tips when defining new resources Completion Format Sets the format of the active window file foreground background color font size etc Tabs Sets tabs and or auto indent for all files Compiler Options Window Cascade Tile Select C and KTL compile options Puts all opened files in cascade order in the window putting one file in front of the other cascading down Sets all opened files in a tile look splitting the work environment into equal parts showing all loaded files at once 70 PN 071 0359 02 October 2005 Table 6 Kedit Menu Bar Description Cont Kedit Option Arrange Icons Help About Kedit Function Arranges the minimized files automatically Select PDF format reference file Display Kedit version information Navigating in Kedit In addition to using the Explore Icons there are other ways to navigate in Kedit Users can click the left mouse button on a table name or object then click the right mouse button and a pop up appears The pop up enables one of the two following text lines Open Document Name of file Go To Definition Of Name resource Go To Definition Of program where the resource resides Open Document defines this particular pattern Open Document defines the CMODULE The example in Figure 40 opens the pattern file called rdaa subroutine kpl If both options are grayed disabled the object is unkn
281. e yield every nth die For example sample size 1 10 This means sample every 10th die to check yield Percentage Pass Fail percent mode The tester stops when the percentage of fails is greater than the number entered here Module number or All composite Total number of devices tested Total number of devices that passed Total number of devices that failed Percentage of fails Fail percentage greater than the number entered Kalos 2 User Manual 151 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 98 Yield Monitor Property Page HI System Front Panel File View Options Utilities Tools Help Gaal mc Y 2 0 Hs EGO Bl ssin sion aora otras chaman credence CA Action Fit Soft Keys ma ro mo ra re re rc re re rao remo reo res ras meas reas Active Slices Bank A Active Slices Bank C Active Slices Bank D Action p FR Soft Keys FK1 FK2 FK3 FK4 FKS FKG FKT FKS FK9 FK10 41 FK12 FK13 FK14 FK15 FK16 FrontPanel Messagg Engineering Engineering application Engineering modes non production is used to login and enable all tools and utilities see Figure 99 When in production mode Shmoo Plot PinMonitor Value Log Bitmap Test Bugger DBM Editor ShowBitz Cal Diag IDRom NVMDIB and Kalos 2 Editor are disabled grayed areas Users must lo
282. eaktrap test read CKBD all Set Up and Execute Pause Breaktrap Setting When the Pause Step Breaktrap is set the user can step through each command line in a test Users can step to the point of loading a pattern then launch the ShowBitz utility to modify timings levels PMU DPS values and pattern uRam contents on the fly EE me d quo T Load the desired test program Select the Pause button The Step button automatically becomes highlighted Select a Debug Slice Choose the Read CKBD all test Click on the Start button to execute the test program The program runs until it reaches the Read CKBD all test It then pauses and waits for the user to click on the Step button Each command line inside the Read CKBD all test is executed sequentially as the user clicks on the Step button Click on the Step button until the Read CKBD all pattern is loaded As the Step button is pressed a display of the test contents can be viewed from the CView utility window Launch the ShowBitz utility by selecting Utilities gt SHOW BITZ from the Front Panel menu bar Select the slice you are breaktrapped on slice AO or slice A1 In the PG Burst window see Figure 110 click on the Run button for the Read CKBD all pattern to execute Click on the box next to loop and press the Run button the program loops on the Read CKBD all pattern Click on the Stop button in the PG Burst window to discontinue looping 178 PN 071 0359 02 October 20
283. earity DNL on a histogram of user captured data The data must be digitized from a sine wave The user is prompted for the following parameters ADC full scale Sine wave amplitude Missing codes threshold The following results are written in the transcript pane DNL maximum error DNL minimum error INL maximum error INL minimum error Offset error Full scale error Number of missing codes In addition the following waveforms are created and placed on the TOS DNL waveform INL waveform The original waveforms are simply pushed farther onto the stack but are otherwise unaltered IntermodDist This operation performs an intermodulation distortion measurement of the TOS waveform The user is prompted for the following parameters First frequency bin Second frequency bin The following results are written in the transcript pane Intermodular distortion Kalos 2 User Manual 267 5 KITE Utilities Table 21 Wf Meas Function Descriptions Cont Menu Item SineCurveFit Function This operation performs a sine curve fit of the TOS waveform It uses a polynomial cubic spline approach to define the best fit sine wave to the TOS waveform The user is prompted for the following parameters Frequency convergence Phase convergence Starting frequency The following results are written in the transcript pane Amplitude Offset Frequency Phase Numbe
284. ears the results of the currently loaded calibration or diagnostic routine Indicates how many times a test passed or failed This is displayed in the summary views Expands all subtests of the diagnostic and calibration routine Closes all subtests of the diagnostic and calibration routine Automatically scroll to the latest result during testing Saves the summary information to a text file Kalos 2 User Manual 197 4 Introduction to KITE Kalos 2 Integrated Test Environment Running Calibration The Calibration program like Diagnostics is invoked by single clicking the Cal Diag icon on the System Front Panel or by selecting Utilities gt CAL DIAG from the menu bar shown in Figure 128 Figure 128 Front Panel Toolbar Utilities menu Cal Diag icon system Front Paval File View Options Utilities Tools Help Gals wm ii RB O boa E Calibration and Diagnostic software programs are located under the File menu inside the Calibration Diagnostic window shown in Figure 129 Figure 129 Calibration Diagnostics Programs fam ih dtsCal fa ih dtsData aih kcal aih kchk Calibration programs Open Files of type Cal Diag Files cal dia x Cancel The standard Calibration program is called kcal cal The program is located in the C Kalos bin directory Running calibration is required before production testing to prevent inaccuracies and confusion during tests A 30 minute
285. ed Power base wf power exp double Raise each data point in the TOS waveform to the indicated exponent Note that the calculator button for this command is labeled Power wf exp pulse all start double stop double range double level algo mode mean cross cnt int proximal double mesial z double distal double Measures all pulse parameters except settling time These include amplitude rise time fall time period and duty factor or pulse width and rising and falling overshoot or preshoot Kalos 2 User Manual 291 5 KITE Utilities Table 26 Commands recognized by AWT user command Interpreter Cont Command Meaning pulse amplitude start double stop double range double level algo mode mean Measures the pulse high and low values and the amplitude of the pulse high low pulse fall start double stop double range double level algo mode mean cross cnt int proximal double distal double Measures the fall time of the falling edge of the pulse The locations of the proximal mesial and distal points are also printed pulse overshoot start double stop double range double level algo mode mean Measures the rising and falling overshoot percentage peak pulse va
286. edit and navigate through the test program Table 4 and Table 6 provide a description of each menu option Figure 39 Pulldown Menu Items w Kedit multi dbm ktl File Edit View Compile Tools Options Window Help Table 6 Kedit Menu Bar Description Option Function Edit Undo Undo the last entry or change Redo Redo the last entry or change Cut Cuts the highlighted section of a file Copy Allows the user to select and copy part of a file Paste Allows the user to paste the copied part of a file to another part of the file or a different file Select All Highlight all text in the file 68 PN 071 0359 02 October 2005 Kedit Table 6 Kedit Menu Bar Description Cont Option Find Find Next Replace Go to Brace Matching Back to Reference Point Function Search engine to find text in the current file Find next occurrence in the current file Find and replace text within the current file Position to line in file based on line number compile error or bookmarks Bounces between brace pairs to ensure proper brace matching matches up a brace at the same nested level Goes back to previous reference point only May be used successively Tabify Selection Not currently available Untabify Selection Not currently available Format Selection Not currently available View Toolbar Enable disable presence of toolbar Status Bar Enable disable presence of status bar
287. eee 362 Data Engine General Installation Procedure ooo oooo 363 Configuration Transferring from Previous Installation 363 Changes Needed for Engineering Environment Lsue 364 Configuration with kalos production iMi ooooooooooooooo 365 DE Global Sells costara daa ELE 365 Local Override Settings for DE DLLs 0000 eee eee 368 Kalos 2 External Datalogging Overview 2 373 Data Engine Connection to Kalos Datalog Stream 373 Dlog Engine Connection to Kalos Datalog Stream 374 Data From Prober DLLs eee 374 Use of Runtime Decode Strings and STDF ini a 375 Test Program Modifications for Data Collection ooooo 376 Switch Datalog Files Generation On Off ooocococoo ooo 376 Selective Datalog Files Generation AA 377 Storing ASCII Strings in the STDF File a 378 Putting C Hook Computed Data Into the STDF File 379 Assigning a Unique Test Number to Each Test and Bin 380 Custom DLL Creation eee 380 Custom DLL Structure ees 380 Required Elements for Custom DLL Creation 380 Custom DLL API Standard Functions oo 381 Standard Event Functions 000 cee eee 381 Exported Functions of DE EXE 2 00000 e eee 383 Custom DLL Generation eese 384 List of Exported Functio
288. eforms must be of type RRECT Selecting Modulate invokes the Phase and Modulate window that requires choosing Modulation type Frequency or Phase and input the output waveform sample interval The defaults are frequency modulation and a 1 0 ns sample interval When modulation is performed both carrier and modulator are linearly interpolated and the result used to modulate the carrier either by frequency or phase depending on the selection made The resulting waveform is pushed onto the stack 262 PN 071 0359 02 October 2005 Waveform AWT Statistic Functions The Statistic functions are DSP measurement functions that return numerical results minimum maximum standard deviation etc They do not alter any waveforms Statistic menu items and a description of each function are shown in Table 20 Table 20 Statistic Function Descriptions Menu Item Function MinMax Wf MinMax Wf Finds the minimum and maximum values in the s TOS waveform and their respective locations The gue CE El results are written in the transcript pane Meanstd Median MinMax Segment Finds the minimum and maximum values in the TOS waveform between two points cursors or axis points and writes the results in the transcript pane section of the Analog Wavetool window MeanStd Calculates the following statistics on the TOS waveform and writes the results in the transcript pane Mean Standard Deviation Varia
289. elect BreakFail 3 Select the Debug Slice NOTE After the failing test is displayed in the Action field the user can launch the ShowBitz utility to modify the current settings e g voltage levels pattern uRam contents To re execute the test select PG Burst in the Navigator tree of ShowBitz Click once on the Run button to execute the failing test To see if any pins failed click on the TG PassFail View under Omni view to display all the channels In order to bin out the device return to Front Panel and click on the Start button A PASS or FAIL flag displays 4 Click on the Start button to execute the program The program breaks on the first fail which in this case is Read 0000 all1 test 5 If the user clicks the Start button again if there are no other failing measurements program execution stops Set Up and Execute LoopTest Breaktrap Setting The LoopTest Breaktrap is useful when examining signals on the oscilloscope While looping on a test the user can launch the Test Debugger application to modify DPS Levels and Timings value on the fly The Apply Set button in Test Debugger allow modified settings to be re loaded to the ETX slice and to Kalos 2 hardware 1 Load the desired program and select a flow 2 Select the LoopTest Breaktrap Setting 3 Select the Debug Slice 4 From the BreakOnTest pulldown menu see Figure 109 select the Read CKBD all test 5 Click on the Start button to execute the program Al
290. enerator RAM Tests intended to determine the cause of a possible malfunction and to suggest a repair strategy A piece of semiconductor with circuitry fabricated on it one location on a wafer compare chip A circuit contained within the PE chip The purpose of the dynamic or load is to provide accurate device loading to the DUT The load is a true constant current source that provides a user selectable IOH and IOL value DUT power supply Dynamic random access memory The circuitry that adds voltage levels to input signals and applies the results to a DUT pin Kalos 2 User Manual 543 A Glossary of Terms DUT DUT fixture EBD EBNF ECR edge edge placement accuracy EMU EOL EOT EOW error error capture file name FLASH force Device under test A circuit board that interfaces the test head to a device under test DUT socket a probe card or a connector for a device handler It has pads to mate with the pogo pins on the pin group cards in the test head and includes power terminals signal lines often microstrip and connections for loads Binary file format for vector data Extended Backus Naur form Error capture RAM Memory module responsible for mirroring the DUT and capturing the fails using device address as an index An abrupt voltage or current change The precision within which an edge can be placed relative to a reference External memory unit Comprises SRAM DR
291. ent datalog results for the selected Kalos slice see Figure 95 The following identifies the numbered sections p E o ae a NG Specifics control and mode selection Datalog file manager save save as close Update the current datalogging by line or at the end of testing Clear erases any information currently displayed in the window Print specifications Selection for datalog slice viewing 144 PN 071 0359 02 October 2005 KITE Software Figure 95 Datalog Property Page _ System Front Panel E l0 34 File View Options Utilities Tools Help hala Se H FE 9 24 AE wl Action FR Soft Keys ma mo ro m rms me rg re ra rio re reo meas raa meas reae Slices Bani Datalog Slices Bank B Datalog Slices Bank C Datalog Slices Bank D NNNM TTTTT T TTTTTT NN NN RE O Max Min PassFail 0 A00 001 CHO FIMY PINS i00un 250u 500m 12 5 Y 1 v NA PASS 0 200 001 CHA FINV PINS 100un 250uR 500m 12 5 Y 1 v NA PASS Test 0 200 001 FIMY FAST PINS Test Mods Site PHY Pin Grp Test Description Force Range Measure Range Max Min PassFail 0 A00 001 CHO FIMY FAST PINS 100un 250uR 500m 12 5 Y 1 V NA PASS 0 A00 001 CH46 FINV FAST PINS 100un 250uR 500mV 12 5 Y 1 v NA PASS Site PHY Pin Grp Test Description Force Range Measure Range Max Min PassFail A00 001
292. ent document window 11 Build Recompiles all files that were updated modified in the current project workspace 12 Rebuild All Recompiles all files in the workspace 13 Stop Build Stops the build of the current project workspace 14 K1 to K2 Translates Kalos 1 syntax CYCLE TABLE to Kalos 2 syntax EDGESET 66 PN 071 0359 02 October 2005 15 16 17 18 19 Bookmarks 20 21 22 23 Kedit Brace matching Bounces between brace pairs to ensure proper brace matching matches up a brace at the same nested level Back To Reference Point Goes back to previous reference point May be used successively Clear Output Window Clears the output window Undo Undo the last entry or change Redo Redo the last entry or change Toggle Bookmark Toggles on off a bookmark for the current line Next Bookmark Moves to the line containing the next bookmark Previous Bookmark Moves to the line containing the previous bookmark Clear all Bookmarks Clears all bookmarks in the window Anonymous Macros 24 25 26 27 28 29 Debug Tools 30 31 32 33 34 35 36 Start Recording Anonymous Macro Records each keystroke for playback until Stop Recording is clicked Stop Recording Macro Stop the current macro Pause Recording Allow other commands before resuming recording Play Anonymous Macro Once Play the last recorded macro Play Anonymous Macro Many Pla
293. ent to display for the indicated waveform set int wave data int double Set the waveform data value in the indicated waveform at the index specified in brackets to the indicated data value double set int wave name lt string gt Set the name of the indicated waveform 294 PN 071 0359 02 October 2005 Waveform AWT Table 26 Commands recognized by AWT user command Interpreter Cont Command Meaning set int wave offset double Set the X offset for the specified waveform The offset is the X value of the first data point in the waveform data array set int wave phase units string Set the phase units string for the indicated waveform Only valid if waveform type is polar set int wave sample rate double Set the sample rate of the indicated waveform to the specified value set int wave x units lt string gt Set the X units string for the indicated waveform set int wave y units lt string gt Set the Y units string for the indicated waveform set cursor location lt string gt double Set the named cursor to the indicated location X coordinate set cursor waveform lt string gt int Set the named cursor to the indicated waveform 0 top of stack set display x begin double Set the displ
294. entation is already loaded into the Kalos doc directory The documentation can be accessed by selecting the Help menu on Kedit application as shown in Figure 34 or by double clicking on KITE Reference Manual pdf or User Manual pdf files located in the Kalos doc directory These files launch the Kalos 2 KITE Reference Manual and the Kalos 2 User Manual respectively Kalos 2 User Manual 57 3 Test Program Definition Figure 34 Kedit Online Help w Kedit Intel 6M jDmsH 4 je mu 2x1 o f FLOW Bitnap CKBD DEMO flow Bitnap AAAA DEMO flow Bitnap Bitfails DEMO flow Bitmap Scanner DEMO flow Shnoo Vlog DEMO flow Shnoo DEMO inflow All test DEMO flow Variables flow Eecroff testcase flow Read DBM FF DBM flow ECR flow Readffff flow BOF ecrOff flow BOF ecr noDUT flow Learn GD data flow Program using DBMfile flow Read using DBMfile flow PNU vs PPMU speed flow Write lfail bof flow Write lfail flow amp Test xlinktoy flow Test PMU RANGE OFF flow Test DPS PMU flow amp DEM Y LINK TO X ECR flow2 General Information Program Development KTL Manual Using C Hooks KPL Manual TPE API Reference ANSE DOR T BOW LO AER ARRRRRRAR ARANA RARA RAR RRA RRA RARA NARA RARARARARAARAR ELEC API Reference About Kedit M FLOW Bitmap AAAA DEMO flow Hi FLOW s itmap CKBD DEMO flow Shorts Erase array Read all ff Write CKBD Read CKB
295. ep qRRI PRAVO BAN A E eee 34 Deleting Folders and Files 0 0 e cece eee eee mI 35 Test Program Definition 224 s22s20eseesecsse te RR ERR RE 37 Test Program Language 2 2 9 90e Qr ede REM Ede m tes e dr b dre eda 38 Kalos Test Language KTL ccc e duced d Ce mag eb ae Ra SI eee de ORE Rd 38 Kalos Pattern Language KPL isses eee Ree eee ees 39 C Source File CMODULE csi cursa NE ot dad nl Rh WAL 40 Test Program File xus d x ck t ca a RO X er CR RC Oe KA ORARE 41 KTL Program File Layout uus duco hacks ha pe toe Rad ae weed d 42 eel P a 44 ii PN 071 0359 02 October 2005 Contents Pil Types T PT 45 PIngroups acia ce KAR Wa Tea E REOR KARLA REESE KE Rc CR REAR SES 47 DC Tests Parametric 2 2 eee 49 Functional Test ss 51 Bin Table etai tonnes a acabe aorta o den M ee ice te Ea Rt nd 51 Flow Statement n 52 Program Files uai dra potuero qued edos teeta a ecd odo ah ede ada 53 CYCLE NAMES 6 5c Ro WAG Dele fe Rud X eO KA ewe ON 54 CONSTANT ic kh KAG Kahi RC CROCO AKEN RR e E ER LAG 54 VARIABLE ieee a d QE dcs RO carie Ar PCR UR MR p doo PNG ve oda d 54 DPSSE mr 54 EMUTEST otra bas xit voe seg ac cao ornate head ee 54 LEVELS S cx doc den cer a Ku NAAN tem acu dude datei acis E UR MCN 54 EDGESET 54s kd neta ahaa KAG Sea aba eae Gea alk al aac KARA KNA ARCA GR ER 55 AXIS DEAN ABALA ii ten esos BKA po TAGA kA eee eee se 55 SAMOO m
296. er DLL 374 production and engineering 361 project creation 385 runtime decode string functions 400 runtime decode strings 375 settings 356 shmoo settings 373 standard event functions 381 static library 385 STDF file viewer 362 STDF ini 375 structure 354 summary settings 372 test execution functions 403 test numbers 380 test program load 361 test program modifications 376 test trigger functions 402 time and date functions 393 work environment functions 398 XY coordinates functions 399 DE Datal Engine Dlog Engine 354 debug tools 67 debug tools Kedit 74 debug viewer 183 209 custom DLL creation 380 custom DLL generation 384 custom DLLs 380 381 data collection 376 Debugging 359 debugger 543 DLL override settings 368 debugger overview 420 DLL settings 386 debugging Dlogserver 373 breakpoints 79 breaktrap settings 154 Kalos 2 User Manual 557 Index KPL 81 patterns 82 source code 78 source code in Kedit 76 test programs 420 using Kedit 75 debugging tool ShowBitz 411 debugging tools Kedit 76 debugging using Kedit 74 definition test program 37 definitions property page Bitmap 529 DELAY time 436 delta information 238 device debugger 212 Device IF property page 123 Device Interface Board DIB 121 448 Device Interface property page 123 device test procedure 200 setup steps 201 device testing main user interface 108 preparatio
297. er in this section Figure 205 Socket File Default 3 Data Buffer Editor EU l1nlxi Fle Leites Tods Help 6a s mm 2 EMU Editor iresses Socket Table Filler only Generated by Display by Rows Columns amp lOs Definitions y NM SN A The Default Socket File has no relationship to any device types Its prime use is to ensure that the application initializes with some pre defined conditions these are 16 lOs 4 Meg of addressing and device symbols from pn00 to pn47 Online The Online Socket File provides a viewer for looking at the socket definition of the currently loaded program file The Online Socket File in is divided into two areas as with most property pages control area and displayed area The displayed area is a read only view of the current socket file Kalos 2 User Manual 345 5 KITE Utilities The first three columns show the device information of Dpins device symbol and the type of function of the Dpin The remaining columns show the Kalos 2 system definitions channel number DPS number ground channel type and address decoder assignment DBM Viewer and Overrides Buffer Memory The pattern segments provide a way for segmenting the current DBM pattern ALL into 256 pieces allowing utility viewers to focus on specific segments of the pattern There are two areas of focus on this property page The following describes the two areas see Figure 206 Pattern DBM sec
298. er the control of the URAM program or logic pattern There is a Store This Vector STV bit in the URAM or LVM that causes data to be stored whenever that URAM is executed This interactive debug feature or advanced datalogger modifies the URAM at debug time allowing the user to examine the state of the PG TG at various points in the program Arming and triggering inhibit storing in this mode after N cycles that have the STV bit set Store Only Fails In this mode only tester cycles with a strobe failure are stored The history RAM can still be armed and triggered however only data from fail cycles will exist in the history RAM at the end of test This mode allows more fail data to be collected since passing cycles are not stored Store This Vector and Store Fail Only This is the default mode for Kalos 2 This is a hybrid mode that stores fails on the tagged vectors cycles only To facilitate its use all logic vectors set stv as do all algorithmic pattern instructions except conditional fail instructions Conditional fail instructions are those which jump increment or call a subroutine based on whether or not a fail occurs in the kpl In this mode it is likely that the user will arm and trigger on first fail since this is the objective of this default The History Ram Control window shown in Figure 51 allows users to set any combination of arm and trigger conditions as well as the number of cycles before and after arm amp trigge
299. er visibility the selected row is highlighted in dark gray and the selected column s in blue In Figure 171 the selected row and columns are highlighted Kalos 2 User Manual 303 5 KITE Utilities Figure 171 Row and Column Selection Logic Debug Tool File Action Edit View Options Help Se Boe suow Bee Ba gt 62H ek B Oz m Qo oA ea AED DEVICE PINS 8 3 10 n07 Pn08 Pn09 3 33 5 T ia ooloooodooo mzo o oio ojo oioioioioioioioioio MZXW ooboooooo 0 9 9 0 0 0 0 0 0 0 0 90 0 0 0 0 0 0 0 0 1 1 i a 1 1 E um 4 i ma foa foa foa foa foma fopa a F e F at MM MMM MMM MM 0 90 0 0 0 0 0 0 0 HR OR o o oioioioio eieimitirioir im BPR RiP RP Bip RR m f fa foa fpa fa fa fa fa 90 0 0 0 0 0 0 0 0 MMM OREM ERE EEK ocoioioioioioioio o oioioioijoioioioio O O O O O O O O O 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 WCD 96x4 ONLINE patlvm96x4V6 The keys Up Arrow and Down Arrow Page Up and Page Down Home and End are available for moving the selection of row up and down The vector data in the LDTool window are shown in correspondence with the VectorChar definition defined in the current test program An example of VectorChar definition is presented below VectorChar 0 2 DD1 DD2 EMASK1 EMASK2 0 0 0 1 ti GEL G2h DC BC 1 DD1 DD2 EMASK1 EMASK2 0 1 1 1 G2H G2H DC DC
300. ero insertion force a kind of DUT socket used for manual device testing Kalos 2 User Manual 553 A Glossary of Terms This page intentionally left blank 554 PN 071 0359 02 October 2005 INDEX Symbols clibrary 41 define 41 endif 41 ifdef 41 include 41 kbi extension 104 Numerics 1 D normal shmoo 472 1 D plot 452 1 D Shmoo 460 528 1 D Shmoo plot 472 2 D plot 452 2 D Shmoo 461 2 D Shmoo plot 473 3 D plot 452 3 D Shmoo 462 3 D Shmoo plot 474 476 AC configuration 15 AC controller box 15 AC datalogger 451 452 518 account password 23 accumulate mode shmoo plots 476 accumulated data shmoo 470 476 active Kalos slices 129 active load 541 active slices 153 198 active test site 541 ADC 541 analog waveform AWT editor 215 Analog Wavetool exiting 298 annotating waveforms 247 anonymous Macro 67 ANSI C language 96 environment 96 APG 541 API 541 application ShowBitz 413 applications launching 33 argument 541 Arm Condition 85 arm condition history RAM 165 ASCII shmoo plots printout 479 ASIC 541 attaching a cursor 238 autorange 541 awtinit cmd file 285 axis selects 462 AXIS statement 55 background color 224 backplane and wiring 7 basic system operation 21 bidir 542 bin table 51 431 433 bin table flow property page 431 bin table test debugger 423 bins categories 134 135 Bitmap 114 applica
301. ers a failure and stops the pattern burst Then goes to the fail flow call Continue On Fail Completes the pattern burst and then goes to the fail flow call Kalos 2 User Manual 449 6 Test Debugger Figure 247 Misc Patterns Property Page Test Debugger Application DPS PMU CONTINUE ON FAIL 450 PN 071 0359 02 October 2005 SHMOO AND BITMAP TOOLS This chapter provides operational descriptions of Shmoo and Bitmap tools An introduction to the BitPower tool is also provided The Shmoo tool includes multiple applications Pin Monitor and Value Log The shmoo is used to characterize various parameters of the device under test by creating a graphic display of the relationship between defined parameters over a range of values Setup parameters are easily entered at any time for any test program A total of 4096 tracking parameters per axis are available and any parameter of the tester can be shmooed against any other The Pin Monitor is an application that allows the user to evaluate the performance of a DUT on a per pin basis The evaluation is performed by creating one dimensional shmoo plots of each system resource that is allocated to a pin with pass fail criteria supplied by the breaktrap test The Value Log application provides an AC Datalogger that is available on Kalos 2 test systems Two types of test execution are available to users a binary search or a linear sweep test The Bitmap tool h
302. ersonnel 2 It observes government mandated requirements for safety issues 3 It complies with the safety requirements in the countries where Credence products are sold These requirements apply to instruction operators maintenance and service manuals for semiconductor test systems and associated apparatus manufactured by Credence Systems Corporation XXX PN 071 0359 02 October 2005 Safety Statements Safety Statements Safety statements in this manual are preceded by Caution Warning and Danger signs that alert readers of hazards of increasing severity A description of these hazards is as follows CAUTION A statement with information essential to avoid loss of data program failure or equipment damage This statement is not used for a personal injury hazard The hazard can only result in property damage or loss The hazard is not immediate e Safety is contingent upon following the message instructions WARNING A statement with information essential to the safety of the operator The hazard is not immediately accessible One level of protection is present between a person and the hazard The hazard can result in personal injury A statement indicating that an imminent hazard exists The hazard is immediately accessible The hazard can result in personal injury Safety is dependent upon awareness and skill No safeguards can be provided Kalos 2 User Manual xxxi About This Ma
303. erty Page The Shmoo display interface property page of the Shmoo Application shown in Figure 251 illustrates a normal 2 D shmoo VCC versus access timing 456 PN 071 0359 02 October 2005 Shmoo Tool Figure 251 Shmoo Display shmoo Application EARE 10 xj File Edk Utities Tools Heb Ej iTest stop Clear K2 E credence File Datapoint ca sche _componten WILLE area A Datapoint July 21 2003 03 21 PM jest DOO ID 5 ar STEPS 50 STOP 55ns STEPS 30 STOP 6 V TACC rng ee 3v a li H a al a H a Mm a a a a il a H An D a L a a al a H HES SSS PAE AAA E PAE AE PAE E AAAH E ES ES DESEE Em Cit Sns 20ns E EU Shmoo Application Messages Preaktrap un 03 21 44 PM Datapoint The X and Y coordinates of a particular datapoint on the shmoo plot are shown in the Datapoint area see Figure 251 of the Shmoo display view when the cursor is placed over that point in the plot As the cursor moves the current XY coordinates of the datapoint are displayed X and Y coordinates are shown whether the shmoo plot has data or not The read back values are up to date to the current selected X and Y axis variables The Datapoint coordinates are displayed in the Point section when clicking left mouse button on a datapoint in the view area The Pt Test re executes the measurement for the selected data
304. es dodi ete o KB delen endo Dor deb iode OE Rod KAG 433 I p TUPTTM 434 TESUBIOCKS mr 435 Test Elements ees 435 SG6ge G8 orreta k edan 1a des euro aye Rho a COR RON Ba WEN tena a i 438 A e e a E a E E E 439 Level Table o is x o ex XC A ek ee CR DR Ra c 439 al AB 440 TIMINGS qox ox rico eR EG ERO hee RA Ree RARA oe x waded 441 Chw Checker i alude Rache Gd 2 bee ACER Rec a OR aad 442 Waveforms coco 443 DPS PMU unie sane ac ol duca AA 443 DETUPS ses Oe Ades ON LSE DREGE Oe A ae ER aie day aNd deo eae 445 COnS VaIS auc a aea and c UR ORC Ales dO a ea Ae ae 446 Misc nym pate S suda rei such e DER ORA Lr de For B PE Had 447 Linn Ep aC PP 448 Patterns Tab zu Ka ib Rue eo kA ast SA Rud GG oa 449 Shmoo and Bitmap Tools 000 ee 451 Introduction llle a 452 Shmoo TOO NAK RR RA REOR Ra Dee EGO ORE ee Pe as RA Xue aC 453 Graphical User Interface less 453 Men Bar 454 x PN 071 0359 02 October 2005 Contents III DP 456 Control Area ens 456 Header tacita ries Won eds EQ path bend 456 View Area aac a wei aa eae Aches CORO KA ea aaa KUA 456 Setting Up the Shmoo Plot s euo bo ce ence MGA PAS cn des 459 Selects Property Page 2 E pee had ne dece he gos elc AG 459 SA A an a ao i a aai 460 TYPES TET Tp TE 460 Axis Selects esr 462 ASCII Outputs i osea ame eio acne ede a Rer te rege 464 Socket File Property Page asic ites LE ee Rh X CARES aet a nace 464
305. esource table to the Kalos 2 hardware When selecting the Set operation unless the debug modes of looping are being executed the user must restart the device program to initiate changes Kalos 2 User Manual 439 6 Test Debugger NOTE The Apply Set buttons are active only if their backgrounds are highlighted yellow The current Break Tests Level Tables or the selected Level Table controls allow for the selection of a specific Level Table of which can be viewed and or edited The selection of three types of views are available Level Table shown in Figure 238 Pin Group or Chn Checker The Chn Checker view is a read only view of the Break Test or any Level Table of the currently loaded program that is decoded to the basic Socket file components Dpins In the Level Table view the white background cells are available for editing All entries are checked against the respective system limits NOTE Undefined pins are shown in red text Figure 238 Levels Property Page Level Table Ed Test Debugger Application E lo xi File Utities Tools Heb i gl Flow Test e Sequence Lovol nominal Levels The Pin Group view option see Figure 239 displays a graphical representation of the levels information for a single pin Levels for each device pin can be viewed by choosing the symbol for the desired pin from the
306. essages num 02 23 03 PM Interactive The Socket File Interactive property page shown in Figure 256 provides a viewer for displaying the socket definition of a user generated socket file This property page is selected by clicking on Get Online gt Transfer gt 466 PN 071 0359 02 October 2005 Setting Up the Shmoo Plot The interactive socket file might not have a relationship to any device type It has multiple uses with the main use of reading a csp extension for source setup parameter file into the tool to check and ensure pin and or pingroups are in sync in the Setups NOTE The csp file extension can be used across Value Log Bitmap and Shmoo Plot tools applications Besides providing a compare table for the internal checks this property page allows for Offline generation of Setups with valid checking Figure 256 Socket File Property Page Online gt Transfer gt Interactive Shmoo Application File Edit Utilities Tools Help sms Linkage Width Qutputs10s DUT Dpins Device Symbols Normal Pin Definition Assignment Type Opt ECE Channel Normal Opt ECE ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS ADDRESS Shmoo Applicat
307. est Level Table when Break Test is selected this window acts as read only and displays the Level Table retrieved from the test program If Level Table is selected a drop down menu appears Use this drop down menu to select the Level Table used by the breaktrap 3 Table shows the currently selected Level Table Channel Levels shows each tester channel with its pin name and the programmed value of each resource Kalos 2 User Manual 499 7 Shmoo and Bitmap Tools Times Window The Times tab displays a window that is similar to the Levels window It allows the user to select an EdgeSet and view the timing and format information for that edgeset Also this application feature can automatically select the edgeset used by the test on which the breaktrap is set see Figure 281 Figure 281 Times Window Fle Edk Utities Toss Hap E E aad sas t Test stop clear e t Pin Monitor Brealtrop jum 10 14 01 AM Following is the description of each field of the Times window 1 Break Test switches between Break Test and EdgeSet When Break Test is selected Pin Monitor retrieves the KTL programmed EdgeSet from the test program If EdgeSet is selected manually select the EdgeSet 2 Break Test Level Table when Break Test is selected this window acts as read only and displays the EdgeSet retrieved from the test program If EdgeSet is selected a drop down menu appears Use this drop
308. et Online or Interactive Socket Table If the Online Socket Table is being used the device program controls the Value Log configurations whereas the nteractive Socket Table allows the user to override any of the Value Log configurations NOTE The Online Socket Table cannot be modified directly but it can be transferred to the Interactive Socket Table where generation deletion and or modification can occur The Value Log test variables setups see Figure 298 are the same as defined by the Kalos 2 Shmoo and Bitmap tools This allows the setups to be interchangeable between the tools 518 PN 071 0359 02 October 2005 Value Log Figure 297 Value Log Property Pages tion Took Help E FT Value Log Property Page HE E E EEUU EUER Sequence p Property Page rero bum Oo Kalos 2 User Manual 519 7 Shmoo and Bitmap Tools Figure 298 Value Log Socket Table and Setups 2 Shn ication File Edt Utities Too Help Sigla iTest stop com Jet Socket Table TIT i8 5 5 5 5 o 5 5 S 9 5 40 EMEN ms LL 48 Pm7 39 Pma Pro Pn22 ADDRESS ADDRESS ADDRESS ADDRESS 20 ADDRESS 21 Pnzo Pn21 ADDRESS ADDRESS 23 ADDRESS ADDRESS ADDRESS ADDRESS
309. et Status Hide Help 0 Al A2 AJ Ad AS AB A AB AS AIO All A2 A13 Al Al5 7C Status image Ready Clicking on the Help button displays all graphical images and provides a description for each see Figure 67 Kalos 2 User Manual 101 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 67 Target Status Image Descriptions About yaTgiMgr TT ti Yet Another Target Manager Version 1 0 arget Icon 9 y 9 uw Copyright C 2001 Down after having been up Embedded processor in pre boot state Embedded processor received permission to boot Embedded processor has communicated on network to Host based server has established contact with embedded processor Test program executor software downloaded to embedded processor Test program executor software initialized rt boot Booted but check targetmar log for loading problems Show Target Manager Log Click on the Show Hide targetmgr log in the pop up window shown in Figure 68 to view or hide the Target Manager log The Target Manager log shows logged information for connections to each target in the test head This view provides detailed information that can be helpful when connection problems occur Figure 68 Target Icon Pop up Show targetmgr viewer Hide targetmgr viewer Show targetmar log Hide targetmgr log Exit targetmgr and viewer 102 PN 071 0359 02 October 2005 Target Manager Removing
310. ex This is selectable by right mouse clicking on the address field Kalos 2 User Manual 89 3 Test Program Definition Figure 56 Counter Group Format DPZ For Help press Fi Choose how to display data presented to Addr M If the data are displayed in a hex format it has the least significant bit LSB on the left side and the most significant bit MSB on the right The data in Figure 57 displays the bits combinations for the counter group in a hex format Figure 57 Data Display in Hex Format Z addr bits X addr bits Y addr bits NorE If in a decimal format it is the decimal equivalent of the hex number TG data stored in the timing generators are listed by the pin ID information for I O pins as it is listed on the socket table of the test program Users can right mouse click to view a pulldown menu that shows a pin options list see Figure 58 Point to the Selected Pins option and select the desired pin from the pop up context menu to display the column of its states The selected pins are check marked The same context menu allows users to Show all Pins or Hide all Pins at once or Show IO Pins only 90 PN 071 0359 02 October 2005 Kedit Two modes are available for showing the states of pins Brief and Detail In Brief mode the cells of the TG field show only pass P or Fail F states To switch the TG field to Detail mode right mouse click on any cell and select Detail f
311. executing pmutest dbus ALIN m MEAS C x apply pmu muitzh BIN XN BINI dut 0 result Pass sbin 1 hbin 1 Mut cesule Peos sbim i hbim i Peat Display for Each Active Slice MH WSRW CView Window The CView window displays all program execution activity It is suggested that the user open the CView window at the start of each session and position the window out of the center of the CRT display where it can been seen but not as the main window The CView utility is accessible in both production and engineering modes That is user login is required Open the CView by clicking the CV icon in the Front Panel window see Figure 134 or by selecting Utility gt CVIEWER from the menu bar Kalos 2 User Manual 209 5 KITE Utilities Figure 134 CView Icon Click here to open the CView window System Front Panel File View Options Utilities F6ols Help taa e a 7 7 NorE The CView does give some run time overhead which causes additional run time in production Menu and Toolbar The following are descriptions of the CView property page menu and toolbar options File Selected Slice standard SaveAs selected slice to file All Active Slices standard SaveAs all active slices to file Exit closes the application Edit Find text View All Kalos Slices show all slices even if not physically present Kalos Active Slices show only the
312. ey are executed along with pass fail checkboxs are displayed in the center The datalog window which displays test results for each individual test is on the right The execution status of the program is displayed in the bottom window Figure 121 Diagnostic Windows o Calibration Diagnostics kchk dia 1 len File Edit View Options Execute Window Help Gg 8 NM n ma E B O quen Print Pause Abort Colors Ho mt o X o i Slice Channel Datalog Summary summary summary i 1 x yi REGMEM CENT OMNI HORM 990000000 o B cem 2 1 xlbinlkchk dia REGMEM CENT OMNINORM S90014130 Act 0x00000 Exp 0x00000 ER 0416000 uu HEGMEM CENT OMNINORM 830014200 MAPINIT REGMEM CENT OMNINORM S90014210 IREGMEM CENT OMNI NORM 990000010 Slices a selected Runniga REGMEM CENT OMNT NORM Test suites in Icon form Status Bar HEGMEM CENT OMNI NORM 990014220 REGMEM CENT OMNI NDRM 380014230 REGMEM CENT OMNI NORM 390014240 REGMEM CENT OMNI NORM 990014250 REGMEM CENT OMNI NORM 39001 4250 REGMEM CENT OMNI NORM 990014270 REGMEM CENT OMNI NORM 990014280 REGMEM CENT OMNI NORM 990014290 REGMEM CENT OMNI NORM 930014300 REGMEM CENT OMNI NORM 990014310 REGMEM CENT OMNI NORM 990014320 REGMEM CENT OMNI NORM 990014330 _ FEGMEM CENT OMNI NORM 990014340 REGMEM CHAT OMNI NORM 990014350 Act Ox0ffff Exp Ox0ffff EA
313. ey string which is defined as Runtime key of string key of string received from Kalos 2 datalog with structure of STATIC LOOKUP UMSG type Key of string in INI key of string in kalos production ini file which is used for connects For example the use of these functions for STDF atr cmd line field filling by runtime decode strings is kalos production ini atr cmd line program name job revisions DE EXE stat lookup is STATIC LOOKUP UMSG type structure Sets values of program name and job revision 400 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine Called each time STATIC LOOKUP UMSG received from datalog kdx add string value LPCTSTR stat lookup key LPCTSTR stat lookup value added per dll DE DLL Connects atr cmd line with program name job revision from INI If atr cmd line does not exist in INI file connects it with Sprogram_name Called only once kdx return kdx initialize void kdx add runtime str atr cmd line program name return 1 Gets value of atr cmd line which is runtime value of 3program name job revisions Called at each STDF file creation void get atr cmd line char atr cmd line atr cmd line kdx get runtime str atr cmd line sets latiest value Return Value Description of Function Name Description Return Value Parameters A Current value of const char E Connec
314. f Dpin function Pin Definition Channel numbers and Assignment Type Normal Opt ECE Kalos 2 User Manual 429 6 Test Debugger Figure 230 Socket Property Page Table Control Area Display Area gt Ed Test Debugger Application Fie Utities Tools Heb TE 2 Package The Package page view see Figure 231 displays a graphical representation of the DUT showing the mapping of the device pins to tester channels The package type may be chosen manually from the choices at the top of the property page The following package types are available DIP SOJ SOP TSOP FLAT QUAD Dual inline package Small outline J lead Small outline package Thin small outline package Lead on both sides Quad small outline 430 PN 071 0359 02 October 2005 Property Page Functions PLCC Plastic leaded chip carrier The default view is of a plastic leaded chip carrier PLCC Figure 231 Socket Property Page Package ES Test Debugger Application Package type choice option Flow The Flow property page see Figure 232 displays information regarding the connection of tests and bins for the selected flow of the current test program Three views are available by way of the control area Bin Table Flow Table and Flow Diagram The different views are accessed by clicking on their corresponding sub property page tabs Bin Table The Bin Table default view lists the data of the current
315. f CMODULE E PINGROUP Ko CONSTANT To VARIABLE E DPSSET Bo PMUTEST f LEVELS E TSET TABLE E FSET TABLE E PSET TABLE o CYCLE TABLE a TIMING Ea AXIS Za SEMOO a VLOG f PATTERN f LOADDEM f SEQUENCE Bo TEST a FLOW E EVENT MAP E BINTABLE a CONFIG To EDGESET BLK B RA SETUP mu SEGMENT TABLE Ko DOMAIN TABLE Ko EDGESET ELT Compiler Output Find in Files For Help press F1 socket 8 IO ktl xe Pot File Name socket 8 IO ktl Created by P Madison Date PAALALA AAAA AA CR RR R OR TAA CR CR RR N OR CR R A RR GR AAA AAA AAA AAA AAA AAA AAA AAA AAA AAA AT TTT 7 29 02 Description This file contains the socket tabel for 8 I Os pingroups and bin table Revision History 7 29 02 File created ff JERCRURCRORUR RUNE RARA RRA RAEE RU CR NOR RUN CR RR RATE A REET AEA RAAT TEAR RAAT BAGANI SOCKET socket 8 IO DP1 DP2 DP3 DP4 DPS DP6 DP DPS DP9 DP10 DP11 DP12 DP13 DP14 DP15 DP16 DP17 DP18 DP19 DP20 DP21 DP22 DP23 DQO DOL DOZ D03 DQ4 DOS DO6 DQ A0 a1 A2 A3 24 A5 A6 A7 A8 A9 A10 a11 212 213 214 IO PIN IO PIN IO PIN IO PIN IO PIN IO PIN IO PIN IO PIN ADDR PIN ADDR PIN ADDR PIN ADDR PIN ADDR PIN ADDR PIN ADDR PIN ADDR PIN ADDR PIN ADDR PIN ADDR PIN ADDR PIN ADDR PIN ADDR PIN ADDR PIN Kalos Pattern Language KPL To be imported into individual test programs 100
316. f fails that occurred for a channel or to indicate no pass fail information for this channel Kalos 2 User Manual 301 5 KITE Utilities Fail Pass without showing the numbers of the occurred fails is indicated in Figure 169 Figure 169 Fail Pass 47 10 13 T HI Do zx CLEE 200 D OD DD D0 DO OD Joe 4 0 48 11 13 i 1 0 orar c o o o o o o o o o o o o 49 12 13 1 alolo x HE c o O G G o o 0 0 0 B oO O0 50 13 13 i aooi zrl TF LE o o o o o o o o o o 0 51 14 13 i tito ol x B a c O D o O o O OF io O D 0 52 is 13 Ion xl Fc D 78 O ol o o o o 0 Goo 53 16 13 i faoo xl 5 6 0 0 0 0 0 0 0 o o o oOo o 54 17 13 3 Kolo x B c cC o o oO 0 o 0 GO oF 0o o o o 55 18 13 3 ioo x tc c co uw d CO GT 0 o 0 JD 0 D 56 19 13 i lool xD r c 0 o o 0 8 D OH 0 0 0 d 57 20 13 icu AAA AAA 10 FAIL SUMMARY FIF P P P P P P P P P P P P P AA LDTool WaveForm LATool DSTool Datalog Ready YCD 96x4 ONLINE patLvm96x4V6 If in the context menu of the Fail Summary row the Show fail summary item is checked then the number of the occurred fails for each failed channel is shown below the symbol F see Figure 170 In Figure 170 Failed channels pins indicated along with the numbers of the occurred fails Figure 170 Fail Channel Pins 47 10 13 1 IA a Ree AA 48 11 13 i 1 0 0 rar aaa c o o o o o o o o o o o o 49 12 13 i aooi x H c lt o o o o o
317. f the instructions contained in the test for which the breaktrap was set in Front Panel The first block contains the name of the instruction or test which occurred directly before the breaktrap was set The middle block shows the contents of the breaktrapped test The last two blocks show the names of the next instructions or tests to be executed The path taken depends on whether the current test passes green line or fails red line Figure 235 Test Property Page Test Blocks ES Test Debugger Application E ADI x File Utikies Tools Heb mal 2 DPSPMU Control Area Test TEST test DOl D 10 pat DOl PERUN Display Area a AAA Test Elements The Test Elements property page see Figure 236 also the test editor is available by clicking the Test Elements button This provides an alternate view of the current test status and component selections Kalos 2 User Manual 435 6 Test Debugger NOTE A yellow highlighted Set button indicates the displayed test is different from the ETX test TEST testppmu fvmi R2M is the selected program test name The Edit Operations allow the user to edit selections in the Selections area to the test sequence by way of Edit Operations options The Selections section displays all current ktl function calls and selectable slice tables for inserting and or appending into the Sequence of the current test The syntax of a test sta
318. femen CIR RR AS Ren 248 Title Marker rer 249 Cycle Marker oe ioe Tr 249 PN 071 0359 02 October 2005 Contents Cycle Count Marker aa 6 2 an KANE a eR aa 250 Vector Marker 0 000 cece eee eee eens 250 Scan Marker ouai dere Lok ri AZNAR ERROR co UR WAG 250 Elapsed Time Marker lle 250 Cycle Set Marker aaa tn IO do REI S Rb d Kha Ro ai 250 Time Set Marker es 250 Compare Marker es 250 Results Marker lees 252 Note Marker 2 lll 253 Generic Marker llle 253 Marker Control in CMD Files 000 cece eee eee eens 253 Marker Syntax In AWAV Files BB 254 Using the Display Buttons su cack ewe O da e Cd RR c ctc 255 Clear as ha eels aR RRA RA a ACA Oe CD RC id 256 PUSH m 256 POD fixe nace e a hare Gan Bee Re COR ea Paes hae PG a d as 256 Bush Sada ded tact tote dide ius 256 SWAD AA fd td Goa 256 Rotate DOWN 2s eb a c e ete ee a Pe a tr uU ee 256 Rotate UP rr 256 Concatenate eee 256 cras MP IPTE 256 Using the DSP Function Menus 0000 2 cece eee 257 Wc Arith Functions 0 0 0 0 cc es 258 Wf Arith Functions eh 258 Wf Math Functions een 259 wf Trans Functions lees 262 Statistic Functions lille 263 wf Meas Functions ees 263 Pulse Functions 0 0c 269 Filter Functions iss aeta i a a a eee ees 274 Windows Functions s aeaaaee 277 Int Diff Functions 278 User F
319. for all channels see Figure 291 Kalos 2 User Manual 511 7 Shmoo and Bitmap Tools Figure 291 Adjust Index Shmoo Application File Edit Utilities Tools Help 13 Click the Pin Monitor tab 14 Click the IO subtab of the Pin Monitor tab 15 Select the IO channel to perform the test on 16 Click the T1 button to run the shmoo of the T1 resource only To run Pin Monitor test for all resources one at a time click the Test button NOTE Since Selected Sequence and Individual are the defaults the test is run on the single pin that is selected 17 Click the Selected Sequence button to go to Auto Sequence mode then click the T1 button again see Figure 292 NOTE In Auto Sequence mode shmoo runs on each channel one at a time The user can view the results of each shmoo by selecting the desired channel 512 PN 071 0359 02 October 2005 Pin Monitor Figure 292 Auto Sequence Test Shmoo Application File Edit Utilities Tools Help ia S Hest amp stop cear Jue t EN NN Pin Monitor umm a Action _No Bresktrap currently set RRM rower Sctups LoveiTine Setups Shmoo Application Messages 04 35 00 PM A 18 First click the Grouped Button then click the T1 button again see Figure 293 NoTE Clicking on the Grouped button automatically changes Pin Monitor to Selected Sequence mode and gives one final result as all of the channel
320. form debug operations such as setting or clearing breakpoints and controlling the flow of execution through the test program Figure 42 Debugging in Kedit Debug Icons 1 2 3 4 5 6 7 8 9 10 11 12 13 14 1 on a euu u PAS GB ADOR PIN x1 PUB PIN ws ADOR PIN x ADOR PIN m A008 PIN n ra A008 PIN m INPUT PIN Na INPOT PIN n Aboa PIN x ADOR PIN m ADOR PIN D anoa PIN x anos PIN ADOR PIN ADOR PIN abos PIN 3 12 4 ADOR PIN ni s w jSRicscilMi BC XC Lond cta tent PIT Variables Window An iz CAS het correos NM 74 PN 071 0359 02 October 2005 Debug Tools Kedit The following is a functional description of each Debug tool icon on the Kedit toolbar shown in Figure 42 1 pt cm i ee ka NG p 10 11 13 14 15 Online Offline Online mode enables debugging through Kedit Offline mode enables test program modification and compiling Note The program cannot be modified from the online mode Load Project After selecting a slice load the Kalos 2 project file Load Program After selecting a slice load the Kalos 2 test program Start KPL Debug Enables debugging for the last loaded pattern PG Run Allows the user to burst the last loaded pattern in debug mode Stop PG Stops pattern burst in the debug mode Insert Remove Breakpoint Toggles breakpoint at the line where the cursor is positio
321. four data points are put into the output waveform 5 0101 A value of 3 for the input produces the following set of four output data points 3 1101 Since in this case only four bits are being looked at the data values of 3 13 19 and 269 all produce the output sequence of 1101 The number of data values in the output waveform is the number of data values in the input waveform multiplied by the number of bits specified Filter Functions Choosing one of the seven finite impulse response FIR filter causes a time domain waveform to be pushed onto the TOS This waveform can be convolved with the next to TOS waveform refer to wf Trans to create a filtered version of the original Filter menu items and a description of each function are shown in Table 23 274 PN 071 0359 02 October 2005 Waveform AWT Table 23 Filter Function Descriptions Low Pass High Pass Band Pass Band Stop C Message Psophometric Brick Wall Menu Item Function Low Pass Creates a low pass digital filter The user is prompted for the following parameters Name Sample Interval Pass Frequency Number of Samples High Pass Creates a high pass digital filter The user is prompted for the following parameters Name Sample Interval Pass Frequency Number of Samples Band Pass Creates a band pass digital filter The user is prompted for the follo
322. from a dbi DBM binary extension file or directly from the Kalos 2 SRAM hardware requires Get support Also the output of the utility generates a dbi or sends output directly to the SRAM hardware requires Set support Operations include Online getting setting and modifying Online DBM Patterns and Offline dbi saved during operations interactions This also allows online or dbi data to be translated into hex files Multiple operations are available but single operation selection is under control of property page selections Four property page operations are available DBM Editor Socket File DBM View and Overrides and Hex ASCII Format The DBMEdit application utility allows the user to select a fixed or defined format for the graphical table views Kalos defined and or user defined The DBMEdit utility is launched by clicking on the DBMEdit icon see Figure 201 or it can be selected launched from the Utilities menu item Figure 201 DBMEdit Icon Click here to open the DBMEdit utility em Front Panel ew Options Utilities Tools Help Gale l 9 deja SAE Ca Primary Window The following is a general description of the primary DBM Editor window File Menu and Toolbar Options DBM File menu pulldown options and the toolbar options see Figure 202 are described below Import dbi Allows importing of a dbi file originally exported for this application and re configures to the input buffer
323. fy the type of waveform you wish to open 3 Browse for the specific waveform file you wish to open 4 Double click the filename or select the filename and click the Open button Working with Cursors Cursors allow you to make measurements on waveforms They appear in the Waveform graphic pane as cross hairs The vertical part of the cross hair follows the pointer the horizontal part of the cross hair always tracks the Y data value for the data point closest to the vertical part of the cross hair Each cursor has a cursor box displayed above the waveform graphic pane Cursors and their cursor boxes track together when you move one the other moves as well see Figure 146 Cursor Boxes A cursor s corresponding cursor box is located as directly as possible above its cursor If a cursor is off screen to the left or the right the cursor box corresponding to that cursor remains on screen but at the side of the screen to show in which direction you must pan to find the cursor If a cursor is attached to a waveform that is not currently displayed a waveform that is far enough into the stack that it is not being drawn the cursor box remains displayed but the cursor will be invisible In order to make the cross hair cursor visible you must rotate the waveform stack up or down until the waveform is visible Kalos 2 User Manual 233 5 KITE Utilities If two or more cursors are close to each other the boxes may not have enough
324. g on by way of the Engineering property page to enable these tools and utilities To login enter the password into the Password field then press the Tab key This enables the Engineering application mode The default password used to login is the Tester ID Name that appears on the Engineering property page header 152 PN 071 0359 02 October 2005 Figure 99 KITE Software Engineering Property Page E System Front Panel File View Options Utilities Tools Help j to es Y 40 9556 S A S wl IStart Stop 5 FR Soft Keys Kalos 2 Active ra ro mes ma me me re re re mo re miz res F4 FKIS FKS Slices Active Slices Bank A Active Slices Bank B Active Slices Bank C Active Slices Bank D Breaktrap Settings Breaktraps OFF Tester ID 4 Engineering Login Break0nTest OllPause Step QBreakNeas OBreakTestSeq BreakFail O LoopTest O LoopHeas FrontPanel Messages Num 04 04 53 PM The Kalos 2 Active Slices boxes see Figure 99 are located on the Front Panel window A box representing each board slice in the test head is reflected The top section of the view area displays the header information for the current test program Header information can only be changed from the Overview property page from any user application Or the information can be changed f
325. ge EN Test Debugger Application Cons Vars Constants and Variables Cons Vars allows for modification of variable values or expressions by editing the respective text field white areas only See Figure 245 Also displayed are the constants and their respective values however modifications are not allowed A program is easier to read and change if certain numbers are assigned a name A CONSTANT statement assigns a unique name to a defined value Once defined a CONSTANT is substituted anywhere within the test program where a value or var expr is used A VARIABLE is a storage place for numbers When it is created it is assigned a unique name and a value using the VARIABLE statement Once created and assigned a value it may be substituted anywhere within the test program where a number would normally be used The DPSSET PMUTEST TSET TABLE PSET TABLE TIMING and LEVELS all accept variable expressions var expr when assigning values to their associated resources 446 PN 071 0359 02 October 2005 Property Page Functions Variables provide a powerful tool for runtime modification of resource values They can also be used to make decisions within a C Hook using TPEGetVar and TPESetVar Variables that do not reference other variables are referred to as scalar Only scalar variables can be modified using TPESetVar or the SET option in a SEQUENCE statement Refer to the Kalos Test La
326. ges DBMEdit has four property pages DBM Editor Socket File DBM View amp Overrides and Hex ASCII Format Select the desired property page view by mouse clicking on the property page tab Some of these views may be toggled between different formats by clicking the View Selections button where applicable The following describes the functions of each DBMEdit property page DBM Editor Viewer The top level window of DBMEdit is sub divided into multiple view or control areas see Figure 203 The following describes each area 1 Menu bar and toolbar interface for selecting operations of the application Property page tab selection Pattern DBM segments and list view pointers selections Control selection buttons and text field entries current edit operations Format header selected titles and data from selected formats Draw area scroll view of the selected DBM pattern and or segment QUIM OBEN me EN M Application message line and status bars The data buffer Viewer option shows online DBM patterns or offline DBM files using multiple formatting graphical displays Kalos defined and or user defined 342 PN 071 0359 02 October 2005 DBM Editor DBMEDIT Figure 203 DBM Editor Viewer Primary Window SE Data Buffer Editor EMU View amp Overrides K2_A 5 MU1 MEM A Hex File No EMU File Output Word bababa permio e 2 7 T2 2 2 5T 3 o epa pepe e 8 Ee 4 TO NE UN cur HM Nec Cre NN 1
327. guration Manager TTarget refer to Target Manager in the Introduction to KITE Kalos 2 Integrated Test Environment chapter of this manual for details must be started before Dlogserver and Data Engine Dlogserver will not attach to core software if started before TTarget If TTarget is restarting Dlogserver and Data Engine must be closed using the tray icon near Windows clock before starting TTarget TTarget and Dlog Engine startup sequence does not matter 364 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine Configuration with kalos production ini The kalos production ini file INI file contains settings for the DE prober drivers and custom GUls DE settings make up the majority of the kalos production ini file They consist of DE global settings DE standard DLL settings and DE custom DLL settings The five main standard DLLs for the DE are STDF4 wafermap multiwafermap summary shmoo and ASCII datalog The default path for kalos production ini is KALOS_HOME Test DevicelF kalos_production ini It is possible to specify another INI file at DE startup as the parameter in the command line It is especially used for working in offline mode The current kalos production ini path is displayed in the header of the settings dialog DE Global Settings Global settings to the DE are those used if no local settings are specified The global DATA ENGINE section contains many settings that can be repeated in t
328. h Tables Fail User and Overview amp BIM Viewer Property pages are selected by left mouse clicking on the desired property page tab Bitmap sub pages Bitmap Editor and Scan Includes the selection of the SRAM for ready display Kalos 2 User Manual 521 7 Shmoo and Bitmap Tools Definitions Display Socket amp Setups Display Online Socket file and Display Socket File Socket Displays the currently configured socket table Setups Set variable resource parameters for overriding the static conditions of the current test if the optional scanner operation is executed Search Tables Fail User Lists failures Error by row or column preference to a text table Overviews amp BIM Viewer Overviews Hardware block diagram support matrix configuration of the Kalos 2 288 Mega bit SRAM with address steering definitions for pointing to the requested ECR sequence start and stop addresses from SRAM minimum to maximum and selected display configuration bim Viewer Allows the user to load and view BIM file either text table or bitmap display The primary windows 1 Mbit display see Figure 300 256 Mbit see Figure 301 of the Bitmap are sub divided into multiple view and or control areas These include the following illustrated on Figure 300 Menu Bar and Toolbar Interface for selecting application operations Property Page Tab Functional selection Breaktrap conditions Controlled by way of the Front Panel
329. h icons for common tasks Delta box for information pertaining to any two selected cursors Name pane for information related to the displayed waveforms Cursor strip for the cursors Graphic pane for displayed waveforms Calculator area for modifying waveforms Transcript pane for errors warnings and test output All major areas of the Analog Wavetool window are shown in Figure 139 220 PN 071 0359 02 October 2005 Waveform AWT Figure 139 Analog Wave Tool Window Menu Bar Delta Box Name Pane Cursor Box Graphic Waveforms Graphic Pane Analeg CET _ Ejoszo n s JEDRENE Samples f 1024 Interval IT n zi s Sample F Type GL de zl fro 00 zu zs Div Poo df AN Div Color Superimpose On Samples 1024 LLY interwal 100 00 n Gls sam le IRRECT VALUE Typ moo Ju Se IDiv gt froo df Ww IDiv sf Color Clear Superimpose KI Clear Swap Segment wetrans gt Fitter Push Rotate down wearth P statistic p windows gt wfAnth gt wimeas intDit gt User gt Calculator Pane DSP functions Transcript Pane Stack listing Pane Throughout the Analog Wavetool there are several Parameter Input dialogs or data entry dialogs Any time one of these dialogs is displayed all other functions of the Analog Wavetool are inhibited until either Accept or Cancel is clicked in the dialog or tab to the button selection and press the Enter key Pressing th
330. h one of the three views to display EdgeSet Chn Checker or Waveforms Figure 240 shows the EdgeSet property page with the white background cells available for editing All entries are checked against the respective system limits NOTE If a Kalos 1 program is loaded or if Kalos 1 timing tables are included then Timings Format and Period property pages are provided In this case a button appears in the Cycles field that allows you to switch back and forth Figure 240 Timings Property Page Timings EdgeSet EN Test Debugger Application Fie Utities Tools Heb Ej Eagosot Tavie cpe pesejos Peroe Sms ageSetingox T 62D l0ns 62D os Chn Checker The Chn Checker property page allows for a Device Pin checker for their respective resources This is a view only property page 442 PN 071 0359 02 October 2005 Property Page Functions Waveforms The Waveforms view in Figure 241 shows a read only display of the timing waveforms for each pin Figure 241 Timings Property Page Waveforms File Ukikies Tools Help Em io Ej gt Program K2 Shmoo Fmt Flow Testlo NERONE AA AA FIFA aaa 200 Overview z 2 RE inen gt gt gt Pazs10z Eset Tats yee ossos EdgeSet Chn Checker poro sone tasse 1 Scale 2ons Test Debugger Messages
331. he GUI do not affect the INI file All changes in the GUI are lost after DE restart Kalos production ini file must be edited for permanent changes If the DE cannot load a DLL in the path specified in the INI file the corresponding checkbox is disabled DE standard DLLs are switched on off by checkboxes STDF4 e Wafermap Summary Shmoo e ASCII The ASCII dll is no longer supported however it remains for legacy applications only DE datalog binary file collection is switched on off by Binary Dump checkbox see Figure 211 DE custom DLLs are switched on off by User 1 User 2 etc checkboxes Paths to these DLLs can be set in corresponding edit boxes Events such as DLLs loading unloading the creation of a test results file and warning messages are displayed in the field at the bottom of the dialog window All messages can also be written to the DE text dump file refer to Collecting Log Files for Debugging The current kalos production ini path is displayed in the header of the settings dialog 356 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine Figure 211 Settings dialog M a Vv D Kalos_1_11_s Debug kds_tpePrintf dll M Ej LI LI 5 mi LI 5 Event messages About Box The About box displays versions of Kalos Software DE EXE all loaded DLLs including user DLLs and kalos production ini Version information can be saved to a text file with the Save As but
332. he OK button to close the Project Settings dialog It is possible to specify different paths for each configuration in the Settings for box Specify DLL in kalos production ini The name of the custom DLL must be set in the kalos production ini to ensure the DE knows the custom DLL exists and where it is located This path must correspond to the path in the project settings Write the full name of DLL for the key USER1 DLL or USER2 DLL in the DATA ENGINE section of kalos production ini Use for the path if DLL is in the default directory for DE DLLs or specify the full path The default directory for DE DLLs is the directory specified for KDX DLL DIR key refer to DE Global Settings For example USER1 DLL custom_test dll Here custom DLL custom test dll resides in the default directory Create DLL Section in kalos production ini The section for DLL must be created in the kalos production ini to contain configuration settings for DLL The kdx tpePrintf section in the default kalos production ini can be used as a template Copy the kdx tpePrintf section to the end of file Rename the section to the name of DLL without the dll extension Enter true for ENABLED to enable DLL Enter the desired extension for created by DLL files in FILE EXTENSION 386 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine Change filename settings in FILENAME and WAFER FILENAME if necessary Apply other local
333. he Toolbar is an arrangement of graphical icon buttons clustered in functional groups that execute commands to KITE These buttons contain the most commonly used commands of the pulldown menu bar The Toolbar is located directly below the menu bar of the Front Panel window If the Toolbar is not present choose View gt Toolbar from the pulldown menu to display it Figure 132 shows the layout of the toolbar and lists the commands executed for each toolbar button Utilities are invoked by a single click of the left mouse button Figure 132 Front Panel Toolbar Shmoo System Operator aa Monitor IF Load bi mik Analog oa Console Datalog DBM Waveform IDRom Project Viewer Engine Editor BitPower Editor ShowBitz VCheck NEN LoT T 4 mm 4 tala 29 E HE Hs Ca Bl e Er KDatalog Test Bitmap Kalos Kalos Cal Diag About Program Bugger Editor Logic NVMDIB Debug Many of these tools are launched only from engineering mode Log in to engineering mode from the Front Panel Engineering tab 208 PN 071 0359 02 October 2005 CView Console Viewer CView Console Viewer The CView Console Viewer utility see Figure 133 is a debug viewer for observing communication messages between the CPU of each Kalos 2 board and workstation computer These communication messages show the processing of events and sequence of execution by the Test Program Executor TPE A display panel appears for each active slice Figure 133 C
334. he X axis so that only the X Select variable setup is active There are no additional Type setups for a 1 D Shmoo Normal Shmoo Tests every datapoint from the first to the last point BINARY Binary search looks for a pass then a fail then selects the next test point in between those two points Binary search is faster than linear search 460 PN 071 0359 02 October 2005 LOG BIN LINEAR LOG LIN 2 D Shmoo Setting Up the Shmoo Plot Example 1 Starts pass fail search in the center of X minimum maximum parameters If pass move the strobe to maximum X If pass move strobe to minimum X If pass move to If pass move to Continue until all test points are verified Example 2 Starts pass fail search in the center of X minimum maximum parameters If pass move strobe to maximum X If pass move strobe to minimum X If fail move to If fail move to Continue until all test points are verified Performs the same search routine as the BINARY search except that it only displays the last pass point and value at the last pass fail boundary Linear search looks for a pass fail at each location This is the most complete shmoo search Linear search is the slowest shmoo search Example Starts pass fail search at the minimum X value It strobes for pass fail and places the result in shmoo display then moves to the next index This process is repeated until all locations are verified Performs the sam
335. he local settings of DE DLLs For that reason settings for the individual DLLs are called local overrides For example if FILENAME is specified under the section labeled kdx summary the local override FILENAME is used for summary files instead of that specified under DATA ENGINE section If duplicate settings exist the setting under the local override is used Global settings are DATA ENGINE Beginning of section of DE global settings REVISION 2 0 0 7 Revision number of the kalos production ini file Not to be confused with the DE major revision NT_PROFILING True Can be True False 1 0 When this setting is True the operator name in any output file is the user name for NT NT_PROD_NAME prod Login which is used for setting production mode refer to Production Engineering Modes OFFLINE z1 Can be True False 1 0 Option to set offline mode refer to Offline Mode KDX DLL DIR KALOS HOME Mestldata engine The directory of the DE DLLs location User defined DLLs can also be in this directory Kalos 2 User Manual 365 5 KITE Utilities OUTPUT DIR D Vogfiles The directory location for data files created by the DE DLLs Users can go to this directory to view data created during test For each data DLL a unique OUTPUT DIR can be specified in the local override For example if all summary files are to go to the D summary directory specify OUTPUT DIR D summary under the kdx summary
336. he midpoint Stop Value shows the stopping value of shmoo determined by the index and number of steps with the programmed value at the midpoint Index when a DPSSET is selected shmoo setup is generated based on the default index value however the user may change the value by selecting one of the predefined values in this window Steps when a DPSSET is selected shmoo setups are generated based on the default value of steps however the user may change the value by selecting one of the predefined values in this window 10 Reset button returns the Index and Steps windows to the default values NOTE Only index and steps can be changed Level Time Setups Window Level Time Setups window allows the user to select the cycle and levels with which Pin Monitor generates the shmoo plots Once this information is input Pin Monitor automatically creates generic setups on a per pin basis for each resource that a pin is allocated to in the KTL program These values may be adjusted manually on a per channel basis This tab is separated into five subtabs which organize the channels by pin type for easier use as shown in Figure 279 496 PN 071 0359 02 October 2005 Pin Monitor Figure 279 Level Time Setups Window 0 077970 L sesu sony so Reset IEEE nr ara f menes mmm n ee Wa el eL Nai Eas ees ee Ka hh a ma sons ins 50 Reset msm ins ro meser sons ans so mese
337. he name of the waveform as it appears in the name field of the waveform patch If multiple waveforms with the same name are attached to the tester the specified parameters are applied to all waveforms of the specified name The read mode command file enable and optionally the command file name are modified tester write string The TOS waveform is written to the tester waveform specified by the string The tester connection must already be established and the specified destination waveform must be the full path of the waveform on the tester trap integr Perform trapezoidal integration of the waveform on the top of the stack tscript print lt string gt Prints the string in the transcript pane tscript read lt string gt Opens the file specified by the string and prints the contents of the file in the transcript pane 296 PN 071 0359 02 October 2005 Waveform AWT Table 26 Commands recognized by AWT user command Interpreter Cont Command Meaning unscramble cycles int Rearranges samples by skipping the entered number of samples It wraps around the last sample and continues from the first sample until all samples are rearranged This can be used to view samples in phase order instead of time order This has been replaced by the Reorder input cycles function which provides more control over the reordering process write ascii awav l
338. he releases of Kalos software versions 1 10 1 and higher the end user has been allowed the flexibility to choose between one of two functions to calculate checksums or CRC s on the data loaded into the DBM by using TPE functions These functions read back a section of the DBM data determined by the programmer and calculate either a simple sum or a CRC cyclic redundancy check of the data within this area These functions are listed below TPECheckCRCDbmData Synopsis UINT TPECheckCRCDbmData TPE_PG tpe_pg UINT dutWdth UINT phy addr UINT len UINT crc Description This function This function performs a 32 bit cyclical redundancy check on data in the DBM Arguments TPE_PG tpe_pg one of TPE_PG1 TPE_PG2 UINT dutWath DUT width width of data bus Valid choices are 1 2 4 8 9 16 and 18 UINT phy_adar starting address UINT len number of addresses to include in check Return Thirty two bit unsigned value which is the CRC of the bytes representing the DUT data 352 PN 071 0359 02 October 2005 DBM Editor DBMEDIT TPEChecksumDbmData Synopsis UINT TPEChecksumDbmData TPE PG tpe pg UINT dutWdth UINT phy addr UINT len Description This function performs checksum on data in the DBM Arguments TPE PG tpe_pg one of TPE PG1 TPE PG2 UINT dutWath DUT width width of data bus Valid choices are 1 2 4 8 9 16 and 18 UINT phy addr starting address UINT len number of addresse
339. he settings pop up window when opening the diagnostic or calibration programs to ensure proper results Summary Window Graphical summaries with viewing options as shown in Figure 124 are available in the Channel Summary options windows To view the graphical summaries select the View menu option or click on the Summary icon in the Calibration Diagnostics window shown in Figure 124 The Summary window appears in compressed form displaying active slices in green 192 PN 071 0359 02 October 2005 Running System Diagnostics Figure 124 Summary Options Click to view Summary windows Calibration Diagnostics Iteration Summary DEK D ble Edt Mew Options Execute Window f le x Di pul E 8 Bs y ev Flow Print Pause Abort Colors About s ww n T S M s Nm ice Channel H a lose A ave Datalog Summary summary Summary Summary Tree Tree Scrol Summary Bi lick to change the slot x ma 7 a E iteration x um E ES E E S IRE Ee 3 E x Fr z O csse siste Ick da ih kchk dia o El marn MAPINIT pa Y CIREGMEN E Qe Ger emu sr d Ganc H Om Gare H Cops re E TM FMT O Omm Expanded Summary Window A matrix chart is displayed in the expanded summary window see Figure 125 The horizontal axis represents the exe
340. he transcript pane also prints the results to the script file To turn the Log Results feature on off 1 Select the Preferences tab from the options window as shown in Figure 142 Figure 142 Preferences Window Options Display 5 Default Locations X Log Results Mark Results Printin Black and White Convert Spaces to Underscores when Saving Undo Level fi OK Cancel Help 2 Select or deselect the Log Results checkbox 3 Click OK Mark Results The results of several waveform measurements most of the pulse characteristics can be displayed as results markers on the waveform s The generation of these results markers can be turned on or off To turn results marker generation on off 1 Select the Preferences tab from Tools gt Options window 226 PN 071 0359 02 October 2005 Waveform AWT 2 Select or deselect the Mark Results checkbox 3 Click OK Convert Spaces to Underscores The Analog Wavetool can automatically convert the spaces to underscores To convert spaces to underscores 1 Click the Preferences tab from Tools Options window 2 Select Convert Spaces to Underscores 3 Click OK Print in Black and White To print in black and white 1 Choose the menu item Tools Options 2 Click the Preferences tab 3 Select Print in black and white 4 Click OK Undo Level To set the maximum number of times you can undo previous operations 1 Choose the menu item
341. he viewer s dimensions Activation of these operations are available by way of the subtab property page Display Socket amp Setups selection Breaktraps settings are required for this operation The breaktrap conditions are highlighted on the Bitmap property page 528 PN 071 0359 02 October 2005 Bitmap Figure 305 Bitmap Scan IIT Fie Edt Wew Wibes Tos FTETEFTLLLLL BITMAP Origin DES Test pt ie E ENTM CT 4 data pts Ready Tresitreo nm IRIKITA Executing the scanner does not destroy the current Bitmap Only when a data point value is set and the point test Test pt is executed does the Bitmap Application tool become updated Definition Display Socket amp Setups Property Page The Display Socket amp Setups Definitions property page allows the user to get online If the Online Socket File is being used the device program controls the Bitmap configurations whereas the Display feature allows the user to override the socket setting of the DUT program NOTE The Online Socket File cannot be modified directly but can be modified by the Display feature of the Bitmap tool The Display Socket amp Setups property page shown in Figure 306 provides a viewer that displays the socket file definition and setups of the initialized tool Kalos 2 User Manual 529 7 Shmoo and Bitmap Tools The Display by socket definition has no relationship to any device type It
342. hen two 48 pin slices are controlled by one tester controller any I O pin can be assigned to any DUT physical pin or ECR pin For parallel 96 pin tester configurations the I O s are in blocks of 96 I O pins Complex sequential programming loops and redundancy analysis programs are executed independently reducing the processor overhead of the test flow to an absolute minimum Higher pin count test system configurations are accommodated by a unique controller design that provides software control from one controller to take synchronous master control of up to eight Kalos 2 systems This allows each test head to be configured as 72 sites of 48 I O pins 36 sites of 96 I O pins 16 sites of 192 pins Parallel operation of up to eight devices from one tester controller supports 576 DUTS with 6 I O pins 2 PN 071 0359 02 October 2005 Introduction The Kalos 2 test system can also be configured in multi slice mode Refer to Table 1 for details Table 1 Multi Slice Configuration Data Slices Channels foie Test 96 36 4 192 16 8 384 8 16 768 4 Not supported in this release version Figure 1 Kalos 2 Test System Kalos 2 User Manual 1 Kalos 2 Hardware Configuration The workstation computer is PC based and runs under the Windows XP operating system The workstation computer is readily networked to a host server using a standard 100 100 Base TX Ethernet A separate private
343. hen in production mode see Figure 73 Shmoo Plot PinMonitor ValueLog Test Bugger DBM Editor Bitmap BitPower Kalos Editor Analog Waveform Editor Kalos Logic Debug ShowBitz Cal Diag IDRom and NVMDIB are disabled grayed areas Users must logon by way of the Front Panel s Engineering mode to enable these tools Refer to Table 7 for a description of the toolbar items NOTE Breaktrap setting and operations also require logon and password Figure 72 Front Panel Toolbar Engineering Mode Shmoo Pin Monitor System Operator Value Lo Monitor IF Eos 8 Analog oa Console Datalog DBM Waveform IDRom Project Viewer Engine Editor BitPower Editor ShowBitz VCheck Tm Ho 2 E HE HP GEO Ble Load KDatalog Test Bitmap Kalos Kalos Cal Diag About Program Bugger Editor Logic NVMDIB Debug Figure 73 Front Panel Toolbar Production Mode Shmoo System Operator Pin Monitor Monitor IF us Value Log Analog oa Console Datalog DBM Waveform IDRom Project Viewer Engine Editor BitPower Editor ShowBitz VCheck poy po m tj ie IBY PA OPERA ETE M KDatalog Test Bitmap Kalos Kalos Cal Diag About Program Bugger Editor Logic NVMDIB Debug Kalos 2 User Manual 115 4 Introduction to KITE Kalos 2 Integrated Test Environment View Area The view area of the Front Panel provides a selection of tabbed property pages with specific overviews of the Kalos 2 hardware and current test program Selected information is disp
344. her Each view has its own shortcuts to other views Whenever a view becomes active the shortcuts view changes to show the links for the active view The toolbar consists of three sections Each section controls a different aspect of the program This includes control of which Kalos 2 slot slice ShowBitz is attached to which channels are displayed only for Channel Views the execution of Send scripts and the record and replay feature Send View The Send View is an environment for creating and running Send Scripts A Send Script is a user defined sequence of commands that manipulate the tester hardware Built in commands can read or write any register in the tester by name For more complex operations the Send Hardware Language SHL can be used The Send View contains an interactive debugger for running Send scripts setting breakpoints single stepping looping etc Any operation that is performed using a Premier View can be performed using Send Message Window Warnings and error messages from ShowBitz are displayed in this window 414 PN 071 0359 02 October 2005 Idrom Idrom Each Kalos 2 board contains five serial electrically erasable non volatile memories Motherboard PMU DPS EMU and TCON for each of the two slices on the board Each is called an IDROM IDROM is an NVM memory chip which stores module information on each Kalos 2 board module This information includes part number revision number etc In a
345. here testing stops None no stopping All Test stop on all test Fails Only stop on fails only Test stop on selected test number When selected a window is provided to specify test number SPC Statistics Process Control is used for tester development only Figure 122 Options Dialog Settings Window Options Dialog Test Conditions Slices Channels Setups Datalog Filters Break Condition Loops iz C None C AlTests Fails Only None aaa gt C All Tests From To C All Tests contro Fails Only From Fails Only y C Testi Run Keys Datalog oit Fe file name 7 Dalalog fle SPC Name of N service_s Mem_Product_Support un ss i calibration cd360 vm data file SpreadSheet Text Iv Summary file Summary file name yl OK Cancel NoTE The calibration data file name and tester speed are standard Credence defaults and should not be altered Pages two see Figure 123 and three of the Options Dialog window are used to select individual slices or channels respectively to be tested Kalos 2 User Manual 191 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 123 Options Dialog Page 2 Options Dialog Test Conditions Slices Channels 2 26 On B Selected Channels Select All Off E 0 767 Apply Clear All Inactive lj Cancel To test a single channel first click the Clear All button then select the channel to be tested NorE Always check t
346. his function measures and displays all pulse functions except for settling time Amplitude This function displays the following Pulse high level Pulse low level Amplitude high low These values are determined by creating a histogram of the data values between the cursors finding the two most populated bins of the histogram then using either the mode or the mean of all data values to determine the final high and low values Note If the pulse being measured is very small and somewhat noisy the function may not be able to discern two discrete levels After clicking the Amplitude the user is prompted for the following parameters Range the voltage size of one bin in the level detection histogram Level Algorithm Mode or Mean Rising Edge This function measures the falling edge The fall interval fall time if the X axis is in time units and the location of the proximal mesial and distal points of the falling transition are printed The user is prompted for the following parameters Proximal percent default 10096 Distal percent default 9096 Range size of one bin in the level detection histogram Falling Edge Level Algorithm Mode or Mean Cross Count number of points above below a level for a valid cross 270 PN 071 0359 02 October 2005 Waveform AWT Table 22 Pulse Function Descriptions Cont Menu Item Period Pulse Width Function This func
347. hmoo plot 459 setups property page shmoo 468 shell command 285 Shmoo 114 shmoo accumulate mode 470 axis selects 462 choosing origin 460 composites 470 conditions setting 460 control area 456 display 456 header 456 online operations 471 PMU 476 print operations 471 setups 468 setups property page 468 Socket File property page 464 toolbar 456 view area 456 XY origin 460 shmoo plot 452 460 550 ASCII outputs 464 Selects 459 setting up 459 shmoo plot 1 D 472 shmoo plot 2 D 473 shmoo plot 3 D 474 476 shmoo plot example 485 shmoo plots accumulate mode 476 ASCII printout 479 Index SHMOO statement 55 Shmoo tool 451 452 Edit 455 GUI 453 menu bar 454 primary window 454 shortcut creating 31 ShowBitz 113 channel views 413 interface 411 Message Window 414 Navigator 413 Omni views 413 Protected Views 414 register views 413 Send View 414 shortcuts views 414 Slice views 413 Toolbars 414 utility 411 shutdown 25 550 sine waveforms 230 sink current 550 sink voltage 550 site 550 site mapping 136 site number 550 skew 550 slew rate 550 slice 550 Slice sort bin results 118 socket file 429 Socket property page 429 package 431 table 430 Socket Table 44 socket table 550 socket test debugger 423 sort bin results 118 sort summary 134 sorted die categories 200 source current 550 source file test program pattern data 55 Source voltage 550
348. hts Clause at FAR 52 227 19 as applicable Printed in October 2005 in the U S A All rights reserved 2005 Credence Systems Corporation Notices Credence Kalos ASL x000 Sapphire and other Credence products and services mentioned herein as well as their respective logos are trademarks or registered trademarks of Credence Systems Corporation in the United States and other countries Gemini is a registered trademark of Micro Probe Inc and is licensed for use to Credence Systems Corporation The following are trademarks or registered trademarks of their respective companies or organizations UNIX X Open Company Ltd Sun Microsystems Sun Workstation OpenWindows SunOS NFS Sun 4 SPARC SPARCstation Java Solaris Sun Microsystems Ethernet Xerox Corporation Microsoft Windows Windows NT Microsoft Corporation All other brand or product names are trademarks or registered trademarks of their respective companies CONTENTS About This Manual 0000s xxi Scope of Manual dnm doe ear RR GR UE a bike ra RR xxii Typographical Conventions orar a ia eed We Re CU RR CR d n RR pad xxiii Menu Conventions rre xxiii Document Conventions lese xxiii Keyboard Conventions 2 6 60 eee eee n hh hn xxiii Mouse Actlons essi 000046 Ru xe ma xke ed Lee eae PA xxiv Related Publications rh XXV Related Manuals 0 00000 cece es XXV Online Help Documentation 00 cece tee xxvi A
349. i or the load project kpj button Toolbar buttons used to perform these functions are described below e Online Offline Online mode enables debugging through Kedit Offline enables test program modification and compiling Load Project After selecting a slice this button loads a Kalos project file Load Program After selecting a slice this button loads a Kalos program file List of Active Modules This button enables users to select the Kalos slice for debugging Choose the flow that is to be debugged in the loaded test program using the flow selection field shown in Figure 45 78 PN 071 0359 02 October 2005 Kedit Figure 45 Flow Selection Br as onsa AG Gam THe o e zh ou we cr ss act EIL ovas ro Flow selection field Watch window Variables field Once this is done users can set the breakpoints within the chosen flow the tests within the flow the sequences within the tests the C functions within the tests or the load of a pattern within the tests This is done by clicking on the insert remove breakpoint button shown in Figure 46 Figure 46 Breakpoint Settings Insert remove breakpoint Highlighted file type and start continue test indicates breakpoint set Dasa ET TYPE 26 LEE 9 p 24 o e 3 LIU Es Ja E include extern int v RESULT c_debugger es Execution pointer A TT Kalos 2 User M
350. ices when the Start button is clicked Testing is completed after test results are reported for every slice at which time the Start button may be clicked again Kalos 2 User Manual 123 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 81 Device Interface Property Page _ System Front Panel um sM A The DLL Libraries area contains a list of software drivers for peripheral wafer probers and handlers From this list the user may install the proper driver for the equipment being used Load the specified driver by clicking on it and then depressing the Load button Confirm that the driver is loaded by the text that appears under Current in the DevicelF Information area see Figure 82 Credence maintains and can provide a list of supported prober and handler equipment drivers 124 PN 071 0359 02 October 2005 KITE Software Figure 82 Device Interface Loading File View Options Utilities Tools Help m k eea Q Deck toma y ox Cancel C 1DUT O Ki mo ma BDUTs Number Wate o E p en y pai i on Dire Test tu fF Open Lookin ca Device e Ea n O Ca Messages File name sim prober smf Files of type sie Mapping Files smp Cancel T Open as read only 1 Control if activated by a loaded dll program and current testing status 2 ListBox showing current dll programs
351. ich the breaktrap is set If the test explicitly defines a DPSSET then choose the Break Test button see Figure 278 If no DPSSET is defined and it is inherited from a previous test then select the DPSSET manually Once the DPSSET is selected the tool automatically creates shmoo setups for the power pins on a per pin basis These setups are based on the default values of the tool but may be modified by the user see Figure 278 Figure 278 Power Setups Window credence CO O a tc Kalos 2 User Manual 495 7 Shmoo and Bitmap Tools Following is the description of each individual field of the Power Setups window 1 Break Test switches between Break Test and DPSSET When Break Test is selected Pin Monitor retrieves the KTL programmed DPSSET from the test program If DPSSET is selected manually select the DPSSET Break Test DPSSET when Break Test is selected this window acts as read only and displays the DPSSET retrieved from the test program If DPSSET is selected a drop down menu appears The user must use this drop down menu to select the DPSSET used by the breaktrap DPS shows currently selected DPSSET Names Resources shows the power supplies that are defined in that DPSSET Programmed shows the value programmed in the test program for the respective power supply Start Value shows the starting value of the shmoo determined by the index and number of steps with the programmed value at t
352. ich to acquire data scope points d Set the number of data points to acquire scope reference vector d cycle d time Jos g scan d d pin s Set the reference value to a vector cycle time scan partition link or pin Time can be set as 1 0e 6 or 1u 1 microsecond scope sample interval Vos Yog Set the time interval between samples T reso Time can be set as 1 0e 6 or 1u 1 microsecond scope start s vog Set the start time Tmin for acquisition relative to the reference point Time can be set as 1 0e 6 or 1u 1 micro second scope stop Jos Mg Set the stop time Tmax for acquisition relative to the reference point Time can be set as 1 0e 6 or 1u 1 micro second scope vmax Jos Jog Set the maximum voltage to be checked Voltage can be set as 5 00e 1 or 500m 500 millivolts Kalos 2 User Manual 293 5 KITE Utilities Table 26 Commands recognized by AWT user command Interpreter Cont Command Meaning scope vmin Jos g Set the minimum voltage to be checked Voltage can be set as 5 00e 1 or 500m 500 millivolts scope vreso s g Set the voltage resolution for acquisition Voltage can be set as 5 00e 1 or 500m 500 millivolts script on name lt string gt Turn output to the log file on If no name is specified the current default last nam
353. id The Scale button allows the user to zoom in or out of the display Grid toggles between showing and hiding grid lines on the flow chart Kalos 2 User Manual 433 6 Test Debugger Figure 234 Flow Property Page Flow Diagram BRO KT TEES mg METAN E Test The Test property page see Figure 235 displays details about the current test for which the breaktrap was set in Front Panel There are two views available Break Test and Select Test As with most property pages Test is divided into two areas control and display The Test property page allows for viewing displaying the contents of Break Test or any selected test of the currently loaded program by clicking on the Select Test Break Test toggle button In Figure 235 testppmu fvmi RZM is displayed The Set button enabled only after executing an edit in Test Elements re loads the modified test to the selected ETX slice Unless debug modes of looping are being executed the user must restart the device program to initiate changes Test Blocks is a display read only area see Figure 235 434 PN 071 0359 02 October 2005 Property Page Functions Test Blocks The Test Blocks property page is divided into four block areas These blocks are provided for interpreting the displayed test or a selected test of the current flow selection They are Entries into Test Test composition PASS Exit and FAIL Exit The Test Blocks display a read only view o
354. igure 60 Definitions and possible entries are shown in Figure 61 NOTE The data shown only appears for a couple seconds while the cursor remains over the edge To redisplay the data drag the cursor over to another edge then back to the original edge 92 PN 071 0359 02 October 2005 Kedit Figure 60 Timing Edge Details pi pi bi ba ba ba tr E bad bi pa t pe H L L lata ia A A e A A AA A Hem 1 ActHi O ActLo 0 Fail ai pi gt bi Pr 54 tr bi 54 B A AAA AAA pi t bi pig Kalos 2 User Manual 93 3 Test Program Definition Figure 61 Timing Edge Definitions H High M Midband X Don t Care L Low G Glitch Once debugging of the pattern code is completed click on the Start KPL Debugger button on the toolbar of Kedit From this point debugging operations other than patterns can be performed If all debugging operations in Kedit are completed click on the Stop Test button on the toolbar then click on the disconnect button The Stop Test button stops the test and the disconnect button disconnects the debugger from the tester This allows the Front Panel to control tester operations from that point 94 PN 071 0359 02 October 2005 4 INTRODUCTION TO KITE KALos 2 INTEGRATED TEST ENVIRONMENT This chapter provides an introduction to
355. ii Figure 68 Figure 69 Figure 70 Figure 71 Figure 72 Figure 73 Figure 74 Figure 75 Figure 76 Figure 77 Figure 78 Figure 79 Figure 80 Figure 81 Figure 82 Figure 83 Figure 84 Figure 85 Figure 86 Figure 87 Figure 88 Figure 89 Figure 90 Figure 91 Figure 92 Figure 93 Figure 94 Figure 95 Figure 96 Figure 97 Figure 98 Figure 99 Figure 100 Figure 101 Figure 102 Figure 103 Figure 104 Figure 105 Figure 106 Target Icon Pop up 0022 eee 102 Project Program Loading sells 105 Test Program Load Process 00000000 eee 106 System Front Panel Window Default View 109 Front Panel Toolbar Engineering Mode 115 Front Panel Toolbar Production Mode 115 Property Page Tab Selection oooocooocoo 116 FUDCUOD BUS cocaina DNE de e Gra Orat 116 Overview Property Page aaa 117 Optional PK2 Sort Results o o ooooooooooooo 119 Optional PK2 Sort MISIOIY cias buste DECRE e wees wie 120 Operator IF Property Page lt lt ooooooooooomo 121 3o err a PA 123 Device Interface Property Page oooooooomoo 124 Device Interface Loading 4 a 125 Summary Property Page Text Sums 127 Summary Property Page Graphics 128 Primary Main Window 0000 eee BIS 130 Primary Window Layout 0 000
356. ile considering const char entry Key name in INI local overrides Destination buffer for char buffer string value kdx get kpi static st r Test Trigger Functions Return Value Description of Function Name Description Return Value Parameters KK On trigger test data T num Trigs will contain valid user int TrigNums NULL data bool useAutoNums false kdx_set_trigger_test_ numbers 402 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine Used for kdx is tNum trigger histogramming test P Test Execution Information Functions kdx get parametric data and kdx get functional data can be called at the KDX DUT TEST to get results of the test execution in ParamData and FuncData structures respectively These structures are declared in the data engine if h file The record fields have the same purpose as STDF records PTR and FTR isValid flag field is different from STDF and represents valid fields in the structures Bit flag macros are also defined in the data engine if h For example to get vector name for functional test FuncData pFuncData kdx get functional data if pFuncData gt isValid amp VECT NAM VALID set vect nam pFuncData vect nam Description o Return Value Parameters kdx get current test Gets test name for Name astexecutedtest WO 3 Gets pattern name for Test pattern name kdx get pattern nam a last execute
357. iletypes that the Analog Wavetool deals with can be divided into two categories Read in Filetypes AWAV awav An ASCII awav file AWG awg An ASCII Kalos 2 AWG formatted waveform CAP cap A raw binary file of longs from the Kalos 2 capture processor This file is generated when using the cp store data primitive NOTE The file read function used to read capture processor files is a generalized file reader and reads any file regardless of whether it contains capture processor data or not Reading an arbitrary file produces unexpected results Spice sp A spice waveform file Save As Filetypes Saving a waveform writes the TOS waveform to the assigned file name There are four filetypes to which you can save a waveform AWAV Kalos 2 User Manual 219 5 KITE Utilities This filetype is automatically given an extension of awav unless a different extension is specified AWG Kalos 2 series only Save as an AWG ready waveform If an extension is provided it is kept otherwise the awg extension is appended to the name when the file is written This is user readable and editable with any standard ASCII editor EDT VI EMACS CRISP Notepad etc Select the target AWG HF LF and the optimization level low noise low distortion Only HF and LF AWG file formats are supported User Interface The Analog Wavetool window contains the following major areas Menu bar across the top Toolbar wit
358. imilar to the above with an integer data value labeled 1abe1Int a double data value labeled 1abe1Db1 a single line text data value labeled labelText1 and a multi line text value labeled 1abeiText2 appears as follows in the AWAV file marker type2 label2 3 0 4 0 LlabelInt 5 labelDbl 6 0 labelText1 One line text labelText2 First line of multi line Second line of multi line Third line of multi line Using the Display Buttons The rectangular area in the lower left corner of the Analog Wavetool window is sometimes collectively referred to as the calculator area The display buttons are the nine push buttons that make up the left half of this area The other buttons are DSP function menus Figure 154 Display Buttons of the Calculator Area Calculator Clear Swap Segment Buttons Push Rotate down we Arith gt Pop Rotate up wt Arith gt Push2 Concatenate wf Math b All operations and measurements with the exception of the Segment function are performed across the entire waveform on a data point by data point basis For binary operations such as add or multiply the sample interval is ignored and the data points of the two waveforms are combined based upon the selected operation The resulting waveform has the same sample interval and number of points as the TOS waveform before the operation Menus DSP Function The display buttons are described in the following
359. in the Flow section Date Time July 29 2003 10 50AM 2 Seriar wo O 1 Flow HULL FLOW Tester ID ccastaldi dxp DIB serial a 5 Enter the information in the Header section including Device Lot Operator and Comment Kalos 2 User Manual 203 4 Introduction to KITE Kalos 2 Integrated Test Environment rogramHame Alpha numeric operatorHame comment User message 6 Click on the Clear Device IF button 7 Select a device library name The selection appears in the Selection box 8 Click on the Load button 9 Any required device input is requested in the dialog box of the selected device The loaded DLL with its respective coding implemented by the user determines if additional input is required This information could be GPIB device name list of wafers number of DUTs to be tested etc 10 The device parameters are displayed under the Current heading when device loading is completed 204 PN 071 0359 02 October 2005 Device Testing Procedure The indicator in the upper right hand corner changes from Direct Test to Auto Test 11 To collect wafermap data during sort refer to the Wafermap Feature section of this chapter to perform the applicable setup 12 Perform setup on the prober or handler to be used for device testing 13 Click on the Start button to begin testing 14 For wafer sort testing completes automatically when
360. in the URAM The following storage modes of operation are provided by the History Ram Control Before After Arm amp Trig These fields are used to stop storing history RAM data after the specified number of cycles are stored If the pattern completes before the specified value is reached only the actual number of cycles stored are available in the history RAM Before Arm amp Trigger Specify the number of cycles to be passed before arm and trigger event 0 to 63 Cycles are stored after all arm conditions are met Kalos 2 User Manual 163 4 Introduction to KITE Kalos 2 Integrated Test Environment After Arm amp Trigger Specify the number of cycles to be passed after arm and trigger event 0 to 63 The sum of Before and After Arm amp Trig must be less then or equal to 64 Store This Vector STV In this storage mode only test cycles with the Store This Vector STV bit enabled are captured in the history RAM In addition if the SOF bit described below is set only STV cycles that fail are stored This interactive debug feature or advanced datalogger allows the user to enable or disable storing of cycles in the pattern that have the STV bit enabled STV is enabled by default for every cycle in a pattern Use of the stvOff keyword disables STV for all cycles until the stvOn keyword is specified These code operations allow the user to specify a block of cycles vectors that will either be stored stvOn or not stvOff
361. ing Shar DI_DEVICE_TYPE kdx get dev info ty representation for string DI DEVICE TYPE DI DEVICE TYPE t E Tia TYPE enum Returns string TT MODE i char representation for string DI TEST MODE DI TEST MODE iot DI TEST MODEt i Returns string DI INTERFACE TYP char representation for E string DI INTERFACE TYP DI INTERFACE TYP DI INTERFACE TYP E enum Et E enum Returns string DI WAFER FLAT char representation for string DI WAFER FLAT DI WAFER FLAT sida DI WAFER FLATt Returns string p DI WAFER ORIGIN char representation for string DI WAFER ORIGIN DI WAFER ORIGIN DI WAFER ORIGIN enum t enum string DI DIE CONFIG DI DIE CONFIG t DI DIE CONFIG enum mr enum Device Pin Assignment Information Return Value DOSCnBUBH Ot Function Name Description Return Value Parameters Parameters Returns number of int Number of device device pins in socket mooo table void CU at 9 pueros e en DUTs sites per l module ee 390 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine Returns string Pin type string representation for pintype and Pin type number in pintype exp PINTYPE enum from members in DPIN nettypes exp h datalog structure Returns string Pin assignment string representation for Pin assignment kdx get pinassign st assign and number in r assign exp PIN ASSIGN TYPE members in DPIN enum from datalog structure nettypes exp h True Succe
362. inuity SEQUENCE dlog off all to zero seq contact pmu MEAS PMU all to zero seq dlog on yi ON FAIL dlog on Jj yi In the example above dlog off turns the datalog stream off at the beginning of the test and switches it back on at the end of the test sequence The ON FAIL sequence ensures that datalog is turned on even when the main sequence reaches a failing point HINT Do NOT use the example below NOTE The following is an example of code that should NEVER be used This is due to the datalog being turned on then off within a test This is the WRONG way to do selective datalog Kalos 2 User Manual 377 5 KITE Utilities Consider the following KTL test TEST Cont io TESTNO 110 DESC This tests for continuity SEQUENCE dlog on all to zero seq contact pmu MEAS PMU all to zero seq dlog off yi bz The above example can cause problems for the following reasons 1 If the test passes the next test may not be setup correctly since the test name and test number are not passed to the DE because datalog is disabled at the end of the test 2 If the test failed then results from the next test may be generated depending on a flow because datalog is enabled NorE Typically the generation of the datalog files includes all tests therefore the method of switching on the datalog in the EVENT MAP is the preferred method
363. ion Messages um 02 28 32PM 7 Kalos 2 User Manual 467 7 Shmoo and Bitmap Tools Setups Property Page The Setups property page contains edit functions for defining variable setups for the X Y and Z axes The Setups property page shown in Figure 257 contains a spreadsheet with data fields for user input of values that define the variable setups The variable setups are then used to set the axis selects conditions on the Selects property page Figure 257 Setups Property Page c Shmoo Application DER File Edit Utilities Tools Help sae A Test sep Gear je itv oe ore ne PCIE r Axis Printout Name Axis Printout gt xAxis dummy System Resource P trx Pinmin Group Symbol Variables Element Rows Shmoo Application Messages NUM 02 33 59 PM The following Setup Edit operations are available for a selected setup These operations are also available on the Edit menu option New Delete Rename e Clear 468 PN 071 0359 02 October 2005 Setting Up the Shmoo Plot Add Element allows you to add another element in the table The following Add Element operations can be selected added to the elements row by clicking on the desired button Time Voltage Current Period e DPS e PMU
364. ion and ETX modules are described in this section Hardware Configuration The Kalos 2 board consists of the main board as well as the following modules see Figure 14 2ETX CPU Modules e 2 PMU Modules e 2 DPS Modules e 2 EMU Modules Figure 14 Hardware Configuration RESET TO OMNI EMU ANG 15VDUT gt k2 DB por 0 OMNI O 20 SUBSYSTEM GND bev POWER SUPPLY Moy POWER SENSING D B POWER SWITCH 418v 415V U a POWER SUBSYSTEM EMUD RESET FEEDBACK SUBSYSTEM T BIF C k CAL FLASH 0 O CALFALSH 1 EIU IDROM D p ETX1 IDROM 1 N li Mou BUS INTERFACE CHIP K2 DB DPS1 N a EMU1 CLK10 SUBSYSTEM C CLK2PS PUT n CLOCK T DISTRIBUTION m LEVEL PE R RS 485 SUBSYSTEM SUBSYS SUBSYS INTERNAL Temp amp k2 DB port 1 BOARD Volt MONITOR Kalos 2 User Manual 17 1 Kalos 2 Hardware Configuration ETX CPU Module The ETX module is used for data transactions The Ethernet inputs data into the ETX the ETX converts this to a PCI signal outputting it to the BIF by way of the ANC and Omni subsystem see Figure 15 Figure 15 ETX Module wu wa There is one ETX or CPU module per slice It has a PI 266 MHz ETX Intel mobile Pentium X86 based controller with 128 Megabytes of DRAM It uses the WindRiver VxWorks AE ROTS real time operating system The ETX has Broadcast capability to write per pin resources or central resources across m
365. ion is two and the maximum number is 101 origin and steps steps 1 to 100 Figure 260 shows a single DUT 1 D Shmoo plot This is considered to be a normal 1 D Shmoo Figure 260 1 D Normal Shmoo July 21 2003 02 16 PM STEPS 50 STOP 55ns TACC rng Num 02 16 19 8M 472 PN 071 0359 02 October 2005 Setting Up the Shmoo Plot Two Dimensional Shmoo Plot A 2 D Shmoo plot consists of two selected variable setups executed across their respective ranges with the resulting pass fail regions displayed on a 2 D coordinate system Options include interpretation of the fail datapoints selected pass datapoint skipping and all accumulation modes Including the original datapoint the minimum number of datapoint in either axis direction is two and the maximum number is 101 origin and steps steps 1 to 100 Figure 261 illustrates a single DUT 2 D Shmoo plot This is considered to be a normal 2 D Shmoo Figure 261 Normal 2 D Shmoo Plot E Shmoo Application Bea loj xj File Edt Utities Took Help wals TACC rng 35ns wa lt lt 18 20n3 35ns Shmoo Application Messages Brealtrap ham 03 21 44 PM Kalos 2 User Manual 473 7 Shmoo and Bitmap Tools Three Dimensional Shmoo Plot A 3 D Shmoo consists of three selected variable setups executing the assigned X and Y variables across their respective ranges with the third variable Z executing either a fail to p
366. ions are displayed in the datalog dialog window at the bottom of Kedit see Figure 53 and on the Front Panel Datalog property page 86 PN 071 0359 02 October 2005 Kedit Figure 53 Datalog Dialog Window imn Tode Optors Window Heb nno va Cm 3 eo HERO Oo Datalog dialog window ENT o n 2 x x x NOTE Users can manually bring up the datalog dialog window by selecting View gt Datalog Dialog from the menu bar The PG section allows users to call up resources from within the pattern generator By default all possible resources loop counters cycle counters address generator data generators etc are displayed in a context menu by right mouse clicking on any line in the datalog dialog field as shown in Figure 54 Select the desired resource to display the column of its value However users can choose between the resources to be viewed Kalos 2 User Manual 87 3 Test Program Definition Figure 54 Resource Selection n 12 13 nin T2 7 14 11 72 73 14 19 12 13 1411 1 x xx xix x x x x x x x x x x x x KIKIA KKKA KKI F ie19 Cd1 Testing The following describes column items on the PG side of the datalog dialog window No History RAM cycle number This number starts at 0 and displays the location of the data within the 64 deep history RAM When checked trigger and arm indicators within the pattern code reflec
367. irements Following are personal computer requirements necessary to run Kalos 2 test systems e Windows XP Professional e 16 bit small font e 1280 x 1024 minimum monitor settings e 1600 x 1200 for special Bitmap Mega Map Table 2 Network Protocols Feature Characteristics Network protocol TCP IP Network software Windows XP Professional 20 PN 071 0359 02 October 2005 Basic System Operation Basic System Operation Following is a definition of terms Home Directory Directory in which the user is placed upon login This is also where user start up files are located Working Directory The current location of the user within the hierarchical directory structure Use the dir command to print working directory Parent Directory This is the directory one level directly above the current directory Child Directory This is the directory one level directly below the current directory V back slash Symbol used to separate directory levels Kalos 2 User Manual 21 2 User Operations Logging Into the System In order to log into a system or workstation a user account is needed User account requirements Auser ID login name A password usually user selected Once a user account is acquired login information including user ID and password is entered at the login prompt in Windows XP as follows The system workstation automatically boots on power up Once booted a
368. itmap Figure 310 Search Tables Fail User Property Page Measurement cell current feature Bitmap Application BEE File Edit View Utilities Tools Help esp bE my C bin CCP E mM A BE Se S e ma S et i Display Socket amp Setups Search Tables Fail User Overviews amp BIM viewer CC Kalos2 Bank Slice AO Bitmap E MUS tres EMU1 MEM A PML OA ERES papecep Addresses Preference IO Array Rows decimal Columns values List by Rows Memory Selects EMU1 MEM A OMEM_B D Copy D Copy MEMLA B MEM B A e Clear Clear Both MEMLA MEMLASB OFFLINE ONLY NUM 03 33 49 PM Overview amp BIM Viewer The Overview amp BIM Viewer property page shown in Figure 311 is a view only overview sub page display of the Kalos 2 SRAM physical layout Users can select either the Socket File definition or the Optional Views in the Source Selects area the right hand side of the property page to see the configuration of the SRAM The Block Diagram window depicted in the Enhanced Memory Unit EMU area left side of the property page shows the layout of the SRAM The Support Matrix area in the center of the property page shows what the Bitmap Application supports The Selected Display Configuration area in the bottom center of the property page shows the current selection of a bitmap with read back diagrams Kalos 2 User Manual 535 7 Shmoo and Bitmap Tools NOTE The BIM
369. k ck ck ck k ck k k ck ck k k ck ck k k kkk k ACKCkCkCk ck ck ck ck ck ck ck ck k ck k ck k Ck k kk k kk kk k ACKCkCk ck ckCckck ck ck ck ck ck ck ck k ck ck k ck ck k k ck ck k k kkk k 4 000 V Ck Ck Ck ck kk ck kk Ck Ck Ck Ck Ck Sk kk ko kk ko kx kx ko ko kokok ACKCkCkCkCck kk ck ck ck ck ck k ck ck ck ck k k k ck k k kkkk KKEKKKKKKKKKKKKKKKKKKKKKKKKKK 3 000 V F as 2 000 V 1 000 V 478 PN 071 0359 02 October 2005 ASCII Printout Examples ASCII Printout Examples Figure 265 through Figure 271 are examples of ASCII shmoo plots which utilize the different options available for execution modes and multiple DUT data gatherings for 1 D 2 D 3 D and PMU plots 1 D and 2 D Plots Figure 265 Basic 2 D Default Setup Program filename Date mon day year Comment user statement Level tablename OPELONS scams X Axis VariableName Stop 35 00nS Y Axis VariableName Stop 1 000 V 5 000 V 4 000 V 3 000 V 2 000 V 1 000 V Ck ck kk ck ck Ck Ck ck ck ck ck kk Ck kk ck ck kk ck kk ck ko Sk ko ko kv ko ko ko ko ko ko Ck ck ck ck ck Ck ck kk Ck ck ck Ck ck kk Ck ck ck ck ck ok kk kk Sk ck Sk k kx KK ko ko ko ko ko Cc ck ck ck ck ck kk Ck kk ck Ck kk Ck ck kk kk Sk ck ck kk Sk kx kv KK kv ko ko ko oko CC Ck ck ck ck ck kk Ck kk ck ck kk ck ck kk ck kk ko kk Sk ko ck kv ko ko ko ko ko ko CC Ck ck ck ck ck ck Ck Ck ck ck
370. k x 0x3f 0000 figer off this location Source line context menu Pow ebook pat debug few X cLdebugger euample Name Value userInputs Ox2200b640 6 endchar Ox2200b641 14 B Pina tot Am Tig Fad TG DP28 DP27 DP26 DP25 m T2 T T4 11 T2 TI T4 11 T2 TI T4 TI T2 TI T4 TH T2 TI 14 wiu izxix t t x x t jtix x tjit zix t ibtir t The currently loaded pattern is debugged from a C source file or from the loaded test program Datalog Pattern Generator PG and Timing Generator TG windows at the bottom of the editor allow users to vertically and horizontally scroll to view and select columns and menus to display the values of variables used within the test program or loaded C source file Within a pattern file users must set the arm and trigger to the required microram URAM location This is set by clicking on the appropriate line of code The context menu of a source line contains the following items 82 PN 071 0359 02 October 2005 Kedit e Arm 8 Trigger This Line e Arm First Instruction e Trigger First Instruction e Trigger ON FAIL e Storage Mode As described in the History RAM Control section of the Introduction to KITE chapter arm and trigger are two conditions that must be met either simultaneously or sequentially first arm then trigger to start and stop storing data in history RAM N cycles later see the number of cycles after arm 8 trigger conditi
371. king on the Break Test button see Figure 287 or by manually selecting the Level Table see Figure 286 used by the test on which the breaktrap is set 506 PN 071 0359 02 October 2005 Pin Monitor Figure 286 Manually Selecting Level Table Shmoo Application 9 Select an EdgeSet either by clicking on the Break Test button see Figure 287 or by manually selecting the EdgeSet see Figure 288 used by the test on which the breaktrap is set Kalos 2 User Manual 507 7 Shmoo and Bitmap Tools Figure 287 Using the Break Test Button Shmoo Application 02 DPO3 A2 508 PN 071 0359 02 October 2005 Pin Monitor Figure 288 Manually Selecting the EdgeSet Shmoo Application File Edit Utilities Tools Help sae credence 1 10 Select the edgeset that the breaktrap is set on see Figure 289 Kalos 2 User Manual 509 7 Shmoo and Bitmap Tools Figure 289 Selecting an EdgeSet Shmoo Application File Edit Utlties Tools Help a E S omm Jes DP01 A9 Socket File 11 Click on the lOs subtab of the Level Time Setups tab see Figure 290 510 PN 071 0359 02 October 2005 Pin Monitor Figure 290 lOs Subtab Shmoo Application File Edit Utities Tools Hep sas DP13 DQ15 12 Adjust the Index and Step values for the shmoo Adjusting these values changes the shmoo setups
372. ktrap was set or any selected sequence of the current program in Front Panel see Figure 237 Sequencer is used as a container of events that can be represented by a name There are two views available Break Test and Sequence Clicking on the Break Test Sequence toggle button allows interaction between the Break Test or any selected Sequence of the currently loaded program The functionality and editing options of the Sequence are the same as the Test property page 438 PN 071 0359 02 October 2005 Property Page Functions Figure 237 Sequence Property Page ECR CLR MEM ECR CLR MEM B IEM A Test Debugger Messages Ready NuM DIHAM 7 Levels The Levels property page displays up to eight DC levels for each pin of a device under test Available levels include VIH VIL VOH VOL IOH IOL VTH and VIHH This information may be displayed in either spreadsheet of graphical format Level Table The Level Table property page provides a text representation of the levels data in a spreadsheet format This property page allows for interaction between the Break Test or any Level Table of the current loaded program The Pin Group and Chn Checker are view only property pages while the Level Table page allows the user to edit and modify the loaded levels for each pin group The Apply Set buttons allows the modified Level Table to re load in the selected ETX slice The difference is the Apply operation also sends the r
373. l increments Scrolling Along the X Axis If any ofthe displayed waveforms extend horizontally beyond the edges of the graphic pane a horizontal scroll bar appears along the bottom of the pane This X scroll bar applies to the TOS waveform and all other waveforms on the stack that have the same X units This means that waveforms having fractional measurement designations will not scroll along with those that display in whole units To scroll waveforms along their X axes Click and drag the scroll box left and right OF Click to the left or right of the scroll box fastest method oe gee Click the left and right arrow buttons at the ends of the scroll bar To scroll waveforms along their X axes using menu options 1 Right click the horizontal scroll bar 2 Choose one of the nine options below to position the waveform as desired 246 PN 071 0359 02 October 2005 Waveform AWT Scroll Here Scrolls according to where you click on the scroll bar Location Scrolls to the X axis point you specify Enter a value and click OK Left Displays the far left of the waveform Center Displays the horizontal center of the waveform Right Displays the far right of the waveform Page Left Scrolls left on the waveform s in page like increments Page Right Scrolls right on the waveform s in page like increments Scroll Left Scrolls left on the waveform s in very small increments Scroll Right Scr
374. l later in the KITE Tools and Utilities chapter in this manual 96 PN 071 0359 02 October 2005 Test Preparation Test Preparation To get the equipment at a Kalos 2 test system ready for a device test you must fit a device test fixture with necessary components mount it to a test head and in most production runs join it to a device handler or wafer prober The device test fixture for a given device has power runs and signal paths designed for accuracy and minimal aberrations The combination of test head and device test fixture is usually set up for one of three testing modes manual device handler or wafer prober The major steps in test station preparation consist of mounting the appropriate device test fixture to the test head and if called for docking the combination to a handler or prober DUT Interface The Kalos 2 system requires a device under test DUT interface board s specifically designed for the customer application The available signals are Tester signal pins DPS force and sense lines Analog ground AGND Analog ground reference DZ Digital DGT Available load board supplies Test Fixtures The Kalos 2 has available a variety of optional test fixtures These include calibration and verification fixtures DUT interface boards for both prober and handler type testers and utility bits Kalos 2 User Manual 97 4 Introduction to KITE Kalos 2 Integrated Test Environment Configuration Man
375. l tests in the flow are executed up to the Read CKBD test Once this test is reached the program loops on the entire test sequence i e timing levels power supply setup 176 PN 071 0359 02 October 2005 Breaktrap Settings loading of the pattern and pattern execution The Action field at the top of Front Panel turns yellow and displays the message Looping on Test Read CKBD all id 2000 6 Adisplay of the test contents can be viewed from the CView utility window NorE The user can click on the PAUSE button to pause looping The program pauses at the beginning of the read CKBD all test As the step button is clicked each line in the read CKBD all test executes sequentially After the read CKBD pattern is loaded the user can launch ShowBitz modify the current hardware configuration and execute or loop on the pattern using the PG Burst window refer to steps 7 and 8 in the Set Up and Execute Pause Breaktrap Setting section of this chapter 7 Ifthe user clicks the Start button again the program begins to loop on the next test in the test flow In this example the next test is write INVCKBD all 8 The user can stop looping either by clicking on the Clear Breaktrap or the Stop button In both cases the pattern generator stops The difference is the BreakOnTest field shows the Null Test if Clear Breaktrap is clicked whereas if the Stop button is clicked it shows the test originally set as the Breaktrap test read CKBD
376. l understanding of the calibration software Refer to the Calibration and Diagnostics section in Chapter 4 Introduction to KITE of this manual for calibration and diagnostics procedures 410 PN 071 0359 02 October 2005 ShowBitz Utility ShowBitz Utility ShowBitz is a Kalos 2 application debugging utility intended for the advanced user It is designed to bypass the layers of software separating the user from the tester It accesses the hardware directly revealing how the tester is truly programmed ShowBitz provides an in depth view into the Kalos 2 hardware All functions of the tester are organized hierarchically and all aspects of tester operation can be explored channels can be studied and registers can be read Equally important ShowBitz has the ability to change the hardware Most views in ShowBitz are interactive Users have the option to choose an item from a list or type in a new voltage and the hardware is instantly changed and refreshed Changes made using ShowBitz do not modify the test program and do not affect the test results datalog summary etc When testing continues changes made using ShowBitz are discarded however ShowBitz has a recording feature that allows the user to easily repeat any sequence of changes made using the interactive views Two of the most basic functions of the Kalos 2 tester pattern runs and parametric measurements can also be performed using ShowBitz ShowBitz is suited for us
377. layed on each page In addition to providing a viewer for specific functions each property page allows for modification of components when the selected environment allows such changes Information on active slices is also provided The selection of a property page is accomplished by moving the cursor over the desired tab and clicking the left mouse button see Figure 74 This action selects the property page and brings it to the top of the stack for viewing Figure 74 Property Page Tab Selection Overview DIB Info Device IF Summary DataLog Vield Monitor DRAMISRAM Viewer The following subsections describe the Front Panel property pages Function Keys There are 16 function keys see Figure 75 that allow the user to activate certain sequences that are assigned for specific uses in the test program To use the function keys click on the appropriate function key Functionality program flow sequences is program dependent Any test sequence can include an FKey seq name function If the key number is active the specified seg name is executed Figure 75 Function Keys F Soft Keys FK1 FK2 rua FK4 FKS Fue Fur FK8 FK8 Fito FK11 FK12 FK13 FK14 FK15 FK16 Active Slices The area labeled Active Slices displays buttons which correspond to Kalos 2 slices in the system Buttons for enabled Kalos 2 slices appear blue in color while those for disabled slices display a black background You can enable disabl
378. lays a pulldown menu showing the defined flows from within the program Kalos 2 User Manual 117 4 Introduction to KITE Kalos 2 Integrated Test Environment The Sort Results gt which toggles to Sort History gt displays the Sort Bin Results of the previous three and current sort results This includes the pass fail condition its sort category and the Kalos 2 slice it was tested on The Configuration area shows DUTs per module of the last program that was loaded This is an information only area functions cannot be controlled The Status area displaying FP Datalog DLogServer Monitor and Device IF are highlighted when enabled Kalos 2 Active Slices are under user control Slices can be enabled or disabled by clicking the respective slice Atleast one slice must be enabled Slices must be physically present slices appear across the panel Slices that appear as disabled require rebooting Overview Property Page Personal Kalos 2 Optional Personal Kalos PK2 sort views are displays in Figure 77 This view optional condition is provided for sort result and or history on a PK2 test system The PK2 is defined as a one board system two slices Optional view is an expansion of the sort history views for the single board tester 118 PN 071 0359 02 October 2005 KITE Software Figure 77 Optional PK2 Sort Results AA x At e a RR Has eme o a v IStart G Stop
379. lication Tool 451 452 518 configurations 518 ValueLog 114 VARIABLE 54 446 VARIABLE statement 54 446 VCH 552 VCheck version check 114 VCL 552 vector 552 vector marker 250 verification fixtures 97 version check VCheck 114 Index view area shmoo 456 view areas summary 129 VIH 552 VIL 552 VIOH 552 VIOL 552 VLog 114 VLOG statement 55 VOH 552 VOL 552 VT 552 wafer 553 wafer map 553 wafer sort 205 Wafermap 200 functional operations 138 Mask Editor 140 property pages 139 Sort Results 139 Wafermap tool 136 functional diagram 138 waveform 553 WAVEFORM AWT 112 Waveform AWT 215 waveform AWT editor 215 waveform colors cycling 225 Waveform Graphic Pane 244 waveforms 443 annotating 247 changing the color of 244 changing the name of 240 complex rectangular 279 components for 242 creating 228 DC 233 filetypes of 219 Gaussian Noise 232 opening 233 parameter details for 229 polar 279 pulse 232 real rectangular 279 recalling 280 saving 280 sawtooth 231 sine 230 storing 280 triangle 230 types of CRECT 242 Kalos 2 User Manual 565 Index Polar 242 RRECT 242 wf Arith parameters 258 wf Math parameters 259 wf Trans parameters 262 window types Chebyshev 277 Kaiser 277 Taper 277 Windows Explorer 29 Windows parameters 277 Windows XP control menu 29 Close 30 Maximize 30 Minimize 30 Move 30 Restore 30 Size 30
380. licitly defined Level Table edgeSet1 Explicitly defined EdgeSet read pat PG RUN y y Resources are inherited from a previous test block if a test which explicitly defined a resource is run followed by a test which does not explicitly define that resource When this occurs the current test inherits the resource from the previous test For example if the Write test is executed before running the Read test the Read test inherits the DPSSET Level Table and EdgeSet from the Write test TEST Write test TESTNO 1 DESC Standard Write Test SEQUENCE normal dps Explicitly defined DPSSET read levels Explicitly defined Level Table edgeSetl Explicitly defined EdgeSet write pat PG RUN y y TEST Read test TESTNO 1 DESC Standard Read Test SEQUENCE read pat PG RUN y y 502 PN 071 0359 02 October 2005 Pin Monitor This difference affects the way a user can configure the Pin Monitor application If a resource is explicitly defined in a test block the user can select the Break Test button to obtain the resource from the test program However if the resource is inherited from a previous test block then the user must manually select the resource from the drop down list in Pin Monitor window Examples The following examples provide shmoo test procedures using the Pin Monito
381. lity is launched by clicking on the IDRom icon on Front Panel as shown in Figure 112 or it can be selected from the Utilities pulldown menu item The IDROM utility appears as shown in Figure 113 Figure 112 IDRom Icon Single click to open the IDRom window ts 2 14 3 50 Hs ame wl The Idrom tool allows users to view this detailed information as well as check serial numbers and other information used to identify the slices mounted on the Kalos 2 boards Kalos 2 User Manual 181 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 113 Idrom Window Online idrom De Edt yew Hep gt HwConf Kalos Board fA B c bD ef1 2 3 4 5 6 7 8 95 m v v n u 5 w T Ta B c p Ta 1 2 3 4 5 6 7 8 9 0 n 2 8 0 15 1 7 ace module Serial Part Number Rev ECO AU KALOS 671 4619 00 Prototype A PML 02380045 100000000 8 H MO vs 01186319W 10 00012700 8 D jan eu 671 4588 00 a C 288 Meg SRAM Prototype AQ TCON 118 7970 00 64 May ETX Pentium 1 C Online idrom AU BACKPLANE 671 9609 00 KZ Backplane AM KALOS amp 71 4619 00 Prototype File Edit View Help Mu PHU 02320075 10 000107 00 8 Wr a tes OZIO 109002700 O a PI Net Preseet j 0 TCON 118 7970 00 64 Mag ETX Pentium 1 gt HwConf Slice Module Serial BACKPLANE 671 460900 K2 Backplane A00 KALOS 02380045 Part Number Rev ECO Remaf Slice 10 Na
382. lnt Performs a Simpson integration on the TOS waveform Trapint TT Trapint Performs a Trapezoidal integration on the TOS Differ waveform Differ Performs a differentiation of the TOS waveform NOTE For waveforms that have an even number of cycles the Trapezoidal integration provides more accuracy User Functions This menu begins with the Shell item Shell prompt window shown in Figure 156 and is followed by the filenames for any scripts that you have created Figure 156 Shell Dialog Shell Prompt x Shell Command To enter a shell command 1 Choose the Calculator menu item User gt Shell This is the same as choosing the menu item Tools gt Shell 2 Enter a shell command 3 Click OK To invoke a script 278 PN 071 0359 02 October 2005 Waveform AWT Choose the DSP menu item User gt lt ScriptFilename gt where ScriptFilename is any script that you have created These can also be accessed by way of the Tools menu option By default the Documents and Settings lt username gt folder is checked This can be changed at Tools Options Default Locations If no appropriate file is found in this location the button is left undefined Working with the Stack The Stack menu item on the main menu bar see Figure 157 displays the current state of the waveform stack with status information about each entry on the stack This information is also displayed in the lower right c
383. log Double clicking any vector data in the LDTool window any signal in the WaveForm or LATool window or the DSTool window to open the Detailed Information dialog Figure 188 and view detailed information on the focused vector char or signal which appears framed by a bold rectangle green by default in the LDTool Waveform and LATool Kalos 2 User Manual 323 5 KITE Utilities Figure 188 Detailed Information Dialog Detailed Information Channel Info Channel Device 1 Pin Name Pn Vector Char Info L DD1 DD2 EDMASK CNT 1 0 0 0 Timing TI T2 T3 TA Period 0 25000 50000 0 60000 Databits databit1 1 Source SRAMO EMUO Bit No O databit2 0 Source SRAMO EMUO Bit No 96 databit3 O Source SRAMO EMUT BitNo 48 databit4 0 Source SRAMO EMUT Bit No 144 History RAM Info LineN Datalog Uram P F 2 D FAIL a FAIL 4 FAIL S D FAIL Toolbar of LDTool The toolbar of LDTool shown in provides the following buttons Figure 189 LDTool Toolbar GE 1 2 SHOW YCD O C A B A TRIG L Find HoL HHaLL H2 E EN STOP y 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 324 PN 071 0359 02 October 2005 1 Online Offline Offline Online AE Wee 1 2 List of active modules IA ile A1 3 Save 4 Arm and Trigger Conditions 5 Show VCD 6 Get Vector Data T Set Vector Data
384. los 2 system 1 Load the desired test program Select the appropriate flow from the Flow pulldown menu the Flow field is in the header section of the Front Panel Overview Property window Kalos 2 User Manual 173 4 Introduction to KITE Kalos 2 Integrated Test Environment 2 Place the cursor on the check box circle to the left of BreakMeas and click the left mouse button When BreakMeas is enabled the check box circle button is colored green In the Breaktrap Settings section under Debug Slice select the Kalos 2 slice you wish to Breaktrap on Place the cursor on the field next to BreakOnTest This activates a pulldown menu displaying all available tests that are loaded in the program In the example shown in Figure 109 test Read CKBD a11 is selected Figure 109 BreakMeas Select Read CKBD all Test ga System Front Panel File View Options Utilities Tools Help mago LIE DN ease wis Action p F Soft Keys re ra me re re rao reat reo reas reas res res l Intell6H Date Time deviceHame Serial Ho Alpha numeric Flow operatorHame Hovember 07 2003 01 28PM All test DENO flow sbtcpull dxp HA Tester ID DIB serial Logoff Mode Engineering Breaktrap Settings Debug Slices Bank A Debug Slices Bank B Debug Slices Bank C Debug Slices Bank D OBreakHeas BreakTestSeq BreakFail O LoopTest O LoopHeas
385. lue and location of the peak based on the supplied parameters Results for both the rising and falling edges are printed If the preshoot amplitude is greater than the overshoot this value is computed instead pulse period start double stop double range double level algo mode mean cross cnt int mesial double Measures the period and duty cycle if three edges are included between the indicated indexes or pulse width if only two edges are included between the indicated indexes of the pulse pulse rise start double stop double range double level algo mode mean cross cnt int proximal double distal double Measures the rise time of the rising edge of the pulse The locations of the proximal mesial and distal points are also printed pulse settle start double stop double stable double level period double delta double Measures the settling time based on the supplied start and stop indexes stable period level period and allowable signal delta No interpolation is done in this function push Duplicate the TOS waveform push2 Duplicate the top two waveforms on the stack 292 PN 071 0359 02 October 2005 Waveform AWT Table 26 Commands recognized by AWT user command Interpreter Cont Command Meaning
386. lues Preview Cancel Help On the left side of the dialog select a waveform type On the right side of the dialog enter the parameters for the waveform you are creating 4 Click OK Waveform Parameter Details The sine waveform parameters are described in Table 8 Kalos 2 User Manual 229 5 KITE Utilities Table 8 Sine Waveforms Parameter Name Name associated with the waveform wavelet Num Cycles M Number of waves to display One cycle equals one complete wave Num Samples N Number of samples distributed over M cycles Sample Interval 1 Fs Time required to elapse between samples Phase radians Fraction of the period of time that is required to elapse with respect to a fixed datum point Amplitude Magnitude of variation in a changing quantity from its zero value Offset Relative location of zero on the Y axis to start the drawing of a waveform The ramp waveform parameters are described in Table 9 Table 9 Ramp Waveforms Parameter Name Name associated with the waveform wavelet Sample per Ramp Number of points per ramp used to create the waveform Sample Interval 1 Fs Time required to elapse between samples Start Voltage Initial voltage of ramp waveform Stop Voltage Final voltage of ramp waveform If stop voltage is lower than start voltage the resulting waveform will have a negative slope Start Delay The duration to maintain the
387. lues for the waveform for the indicated cursor zoom region lt string gt lt string gt The same as zoom cursor but the Y axis of the waveform s for the indicated cursors is zoomed as well Kalos 2 User Manual 297 5 KITE Utilities Printing a Waveform To print a waveform 1 Choose the menu item File gt Print or click the Print icon in the toolbar 2 Inthe dialog that displays choose what you wish to print 3 Print TOS Waveform Prints only the TOS waveform with pertinent information about the waveform minus the cursor 4 Print Stack View Prints everything on the screen including the Name Pane all patches shown the cursors and the cursor boxes Click OK Set the rest of the print preferences click OK Closing a Waveform To close a waveform file 1 Move the waveform to be closed to TOS 2 Inthe display button area lower left corner of the tool click the Pop button Exiting the Analog Wavetool To exit the Analog Wavetool Choose the menu item File gt Exit e Click Yes See Figure 164 Figure 164 Exit Dialog Box TI New Ctrl N gt Open Ctrl O SaveAs Ctrl S amp Print Ctrl P Q Exit Analog Wavetool 298 PN 071 0359 02 October 2005 Logic Debug Tool Logic Debug Tool The Logic Debug tool LDTool is a front end application intended for advanced debugging editing and running of test patterns as well as
388. ly when the Setup property page is selected These commands are discussed in detail in the Setups Property Page section of this chapter Utilities pulldown menu Launches the selected utility application Tools Pulldown menu Launches the selected tool application Help Pulldown menu About Shmoo Displays the current revision information for the Shmoo tool Kalos 2 User Manual 455 7 Shmoo and Bitmap Tools Toolbar The toolbar is an arrangement of graphical icon buttons clustered in functional groups that when chosen execute commands These buttons contain the most commonly used commands of the File and Selects pulldown menu options located on the menu bar When displayed the toolbar is located directly below the menu bar of the main application window Figure 250 shows the layout of the toolbar and lists the command executed for each toolbar button Figure 250 Shmoo Toolbar Export Import Setups Setups Print About GE 5 Control Area The Control Area in Figure 249 contains buttons to start testing stop testing and clear the current shmoo data Header The Header area in Figure 249 consists of a working shmoo plot header showing the current status of the X Y and Z axes View Area The view area provides a display of the selected property page Moving the cursor over the desired tab and clicking the left mouse button accomplishes the selection of a property page Shmoo Display Prop
389. m to the TOS Select the desired waveform from the Stack menu Kalos 2 User Manual 279 5 KITE Utilities Storing Recalling a Waveform The Analog Wavetool has 10 waveform registers numbered 0 through 9 as shown in Figure 158 Figure 158 Waveform Registers Analog Wavetool File Edit View Tester SEGG Stack Tools Help 4 empty 5 empty B empty 7 empty 8 empty 9 empty Waveform Registers To store the TOS waveform in a register 1 Click the Store menu 2 Choose any empty register The menu notation by the register you choose changes from Empty to the name of the stored waveform The X and Y scale and position data is stored To recall a waveform from a register 1 Click the Recall menu 2 Click the register that contains the waveform you wish to recall The waveform automatically becomes TOS The X and Y display values are restored Saving a Waveform Saving a waveform writes the TOS waveform to disk in the specified file type The file name is derived from the name specified in the Name field upon creating the waveform The name can be changed in the Save As dialog 280 PN 071 0359 02 October 2005 Waveform AWT Figure 159 File Menu Analog Wavetool EN View Tester Store Recall Stack Tools Help TY New Ctrl N gt Open Ctrl O Save As Ctrl S amp Print Ctrl P To save a waveform to disc 1 Choose the menu item File
390. main board 17 main clock 7 manually moving a cursor 237 MAP INIT 113 199 418 mapping active slices 198 mapping sites 137 marker color 224 markers controlling in CMD files 253 general 247 syntax for 254 types of 248 marking results 226 mask 547 maximize buttons 30 maximum waveform display 225 MEAS PMU DPS 436 MegaMap 451 521 memory module s 547 menu bar Front Panel 110 METE variables Bitmap setup 533 METE variables shmoo setup 469 microRAM uRAM 547 minimize buttons 30 modes points 223 user units 223 modifying a cursor 235 module 547 monitoring errors and warnings 283 multidie probing 547 multisite 547 multisite testing 547 MUX 547 Name Pane 239 navigate in Kedit 71 network support 20 networking 20 new password 23 non production mode 115 152 non volatile 547 Non Volatile Memory NVM 448 normal 2 D Shmoo plot 473 note marker 253 NVM Non Volatile Memory 424 447 448 NVM help 448 NVM ID s property page 448 NVMDIB 113 Index NVMDIB utility 122 416 Off switch main 14 Omni 548 On Off switch 14 online documentation xxviii online help 57 online operations shmoo 471 opening a waveform file 233 operating environment 20 26 operational test sites 548 overshoot 253 Overview area test debugger 428 Overview property page 117 overview in test debugger 423 overview test property page 435 overview tester 1 PAC 548 panes
391. marker does not cause anything to be drawn but the data is stored until the companion stop window compare is found Stop Window Compare Marker The stop window compare uses the data gathered from the start window compare to draw the window comparison indication in the waveform patch The X coordinate is the stop compare time The Y coordinate is used only when the comparison type is tristate when it contains the comparator high threshold the start window compare Y coordinate contains the low threshold The label is unused If the comparison type is low a rectangular box is drawn from the top of the patch down to the low threshold start compare Y coordinate between the start and stop times start window compare X coordinate and stop window compare X coordinate If the comparison type is high the box is drawn from the bottom of the patch up If the type is tristate both low and high boxes are drawn The color of the compare box is the same as the waveform Kalos 2 User Manual 251 5 KITE Utilities Results Marker Results markers are generated by the Waveform tool when results marking is enabled and a pulse measurement function is performed on the top of stack waveform The X and Y coordinates determine where the marker is drawn the label indicates how the marker indication is to be labeled All results markers are drawn as a cross hair with the label printed to the right of the cross hair vertical and just above or below the cross
392. message appears on the screen prompting the user to press Ctrl Alt Delete to log on see Figure 16 Figure 16 Logging On Begin Logon UR Press Ctrl Alt Delete to log on EE Pressing the Ctrl Alt Delete keys simultaneously invokes the Logon Information window which asks for a user name and password see Figure 17 Note that user name and password are case sensitive Figure 17 Logon Information Logon Information EX Enter a user name and password that is valid for this system User name Password TO 22 PN 071 0359 02 October 2005 Logging Into the System User Password When you first acquire a user account a standard password should be assigned to your account This helps to maintain the integrity of your programs and data The assigned Windows XP system administrator should have tools for managing user accounts Before changing your account password contact the system administrator for any additional instructions or requirements The system prompts you to enter your old password for confirmation before allowing you to change passwords Enter your current password and press the Return key The system now prompts you to enter your new password Again password characters are not displayed on screen Enter the new password and press the Return key The system prompts you to enter your new password again to confirm what you entered is correct The system informs you that your passwo
393. mplished by moving the cursor over the desired tab and clicking the left mouse button This action selects the desired property page and brings it to the top of the stack for viewing The following sections describe the functionality of each Test Debugger property page 428 PN 071 0359 02 October 2005 Property Page Functions Figure 229 Overview Property Page ES est Debugger Application File Utities Tools Heb aja Ani xi Program K2 Shmoo Fmt Flow TestlO r nc Property A Front Panel doesnot have a Breaktrap currently set Page Tabs oo WEECOHENN S Sequence Levels View Area gt Socket The Socket property page see Figure 230 provides a view of the socket definition for the currently loaded test program file The Socket property page as with most property pages is divided into two areas control and display Two views are available on this property page Socket File and Package Under the control area the user can select either the Socket File text table or the Package display graphical display of the Device Under Test DUT The display area is a read only interruption of the current socket file Socket File Socket File is the default view see Figure 230 of the socket information This is a spreadsheet formatted text representation of the current socket file From left to right the columns provide information on DUT number Dpins Device Symbols and type o
394. n 97 DFT 543 DG 543 DGRAM 543 diagnostic program kchk dia 187 diagnostic tests 543 diagnostics programs 185 DIB Device Interface Board 448 DIB help 448 DIB Info 121 DIB NVM data 121 dibcal cal 185 die 543 diode bridge 543 directories 21 directory file structure 26 directory levels 21 directory preferences 227 display maximum waveform 225 mode 223 stack 224 display buttons 255 Display Socket amp Setups property page Bitmap 529 DLL Dynamic Link Library 354 Dlog Engine 354 Dlog Engine also see DE 354 DLOGServer 112 documentation xxviii documentation Kalos 2 57 DPn 45 DPS 543 DPS power supplies property page 443 DPS IMeas 452 DPS modes test debugger 424 DPS modules 17 DPS plots 476 DPSSET statement 54 DRAM 543 draw area summary 130 drawing style 223 driver 543 DSP operations 257 DSTool 314 DUT 544 DUT and interface 12 DUT fixture 544 DUT interface 97 EBD 544 EBNF 544 ECR 544 edge 544 edge placement accuracy 544 EdgeSet 441 EDGESET statement 55 Edit tools 64 editor DBM 342 elapsed time marker 250 Electromagnetic Compatibility EMC System requirements xxxiv Emergency off EMO control 14 EMO emergency off control 14 EMU 544 EMU modules 17 Engineering application mode 115 Engineering login 152 Engineering modes non production 152 environment variable 285 EOL 544 EOT 544 EOW 544 error 544 error capture 5
395. n Descriptions Cont Menu Item Function Mux Multiplexes data from the TOS waveform data that gets replaced by the result Some A D converters store an output signal in two or more output words for example storing a 16 bit signal in two 8 bit words The unpacked information must be multiplexed in order to process the signal properly The number of bits used per sample means the number of valid bits per data word In other words out of 32 bits per word of data how many are valid Mux Factor is the number of input data samples to be multiplexed into each sample of the output waveform The operation takes M bits Bits per Sample from each N successive points Nbr of Samples in the TOS waveform and multiplexes them together into a single point in the resultant waveform The number of points in the resulting waveform is the original number divided by Nbr of Samples Note Mux and Demux are not the inverse of one another Demux Demultiplexes data from the TOS waveform data pushing the resulting waveform s on top of stack The operation extracts up to four waveforms from the TOS waveform Each non zero mask is applied to each value in the TOS waveform to yield another waveform that is then pushed onto the stack The waveform for mask 1 is pushed onto the stack first followed by waveforms for mask 2 3 and 4 if specified Note Mux and Demux are not the inverse of one another Reorder Reorde
396. n are adjusted as well The waveform is centered between the minimum and maximum data values included between the cursors The maximum and minimum values are one minor division from the top and bottom of the display patch respectively Find Level Prompts for a level and an edge rising falling or either as shown in Figure 149 236 PN 071 0359 02 October 2005 Waveform AWT Figure 149 Find Level Window Find Level x Level 0 0 Edge Rising OK Cancel Help The Find Level window option allows for positioning of the cursor at the next location in the waveform that crosses the level in that direction If the cursor is not assigned to a waveform this operation assigns it to the top of stack waveform Set Track Cursor Provides a list of other cursors Selecting None turns tracking off When a cursor is set to track another it maintains the same relative X value as the cursor being tracked The cursor tracks the original cursor when the original cursor is moved Cursors can be chained for example cursor B tracks cursor A and cursor C tracks cursor B The act of setting one cursor to track another is not by default reciprocal Setting cursor A to track cursor B does not cause cursor B to track cursor A You can move cursor B by itself or move cursor A with B tracking it and maintain the same relative X separation In order to have cursor A track cursor B and B track A you must set each tracking separa
397. n button changes the scale factor to 1 0 If the displayed scale factor is manually set to 2 5 pressing the up button still changes the scale factor to 5 0 but pressing the down button changes the scale factor by the nearest step in the 1 2 5 sequence and the result is 2 0 Kalos 2 User Manual 243 5 KITE Utilities Color The user can choose any color for a waveform To change the color of a waveform 1 Click the color bar to the right of the Color label 2 Use the color palettes and or the color value tab to create a waveform color 3 Click OK Superimpose On Off Superimposition displays a copy of a waveform patch onto the TOS waveform This is useful for evaluating differences between waveforms Several waveforms can be superimposed simultaneously To turn the superimpose feature on off 1 In the name pane section for the waveform you wish to affect click the Superimpose On button The waveform is superimposed upon the TOS waveform and the button reverts to read Superimpose Off The scale and scroll values that are used to display this waveform in its own waveform patch are used to display it superimposed on the TOS waveform Any modifications to a superimposed waveform are reflected in the TOS waveform patch Any markers that are enabled display their graphical representation in the TOS patch but no text is printed All marker text applies only to the patch in which it appears 2 Toturn the superimpose feature
398. n num false sprintf bufr1 8d cnt if strlen strbuf strlen bufr1 gt PRINTSTR SIZE fprintf fp 96s strbuf strcpy strbuf STR2HDR j strcat strbuf bufr1 Get totals sprintf bufr1 8d hbin cnt strcat strbuf bufr1 sprintf bufr1 6 2f n float hbin cnt float num tested 100 00 strcat strbuf bufr1 fprintf fp 96s strbuf fprintf fp End n fclose fp Run created file with postprocessor kdx runBatchFile LPCTSTR fname return 1 Kalos 2 User Manual 409 5 KITE Utilities Cal Diag The Kalos 2 tester is calibrated by running calibration diagnostics from Front Panel Calibration beyond power supplies is performed by software which requires no manual manipulation In order to execute calibration however manual intervention is required to mount two types of load boards at various points in the process The Calibration Diagnostics utility is launched by clicking on the Cal Diag icon see Figure 218 or it can be selected launched from the Utilities menu item Figure 218 Cal Diag Icon Click here to open the Cal Diag utility Help j FE 4994 O 5 5 TTS YN The Calibration programs are located in the directory C Kalos bin The calibration data is stored in the ETX on the tester There may be other programs visible in the menu however they are not standard maintenance programs and should not be run without ful
399. n the following KTL Program Segments TSET FSET PSET TSET tset4 DESC CECONTROL T1 5ns T2 90ns Yi OECONTROL Tl 10ns T2 90ns Yi WECONTROL T1 5ns T2 95ns Yi DBUS T1 80ns T2 85ns Yi ADDRESS T1 5ns T2 90ns H tset for read 486 PN 071 0359 02 October 2005 Shmoo Plot Example FSET fset6 DESC fset for read CECONTROL F1 G2L F2 G2H y OECONTROL F1 G2L F2 G2H y WECONTROL F1 G2H F2 G2H y DBUS Fl ED F2 DC y ADDRESS Fl G2D F2 G2D PSET pset2 DESC pset for read tests MAIN 200ns ALT 200ns 3 Create a shmoo plot to measure the minimum value of the address access time tacc In order to achieve this the DBUS pingroup on the X axis must be moved from 85 ns tacc 80 ns to 45 ns tacc 40 ns Vary the value of VCC on the Y axis from 2 5 V to 5 V 4 Step 1 Before launching the Shmoo tool application the user must Breaktrap on the read AAAA fast test In the Engineering property page of Front Panel select BreakMeas Then in BreakOnTest field select the read AAAA fast test Press Start button for the test program to execute Step 2 From Front Panel launch the Shmoo tool by selecting Tools gt Shmoo from the menu bar Kalos 2 User Manual 487 7 Shmoo and Bitmap Tools Step 3 Once the Shmoo tool window
400. n the test head Next the Front Panel application can be launched or a custom GUI application designed to perform Front Panel functions 98 PN 071 0359 02 October 2005 Configuration Manager Figure 64 Start Target Manager 4 Kalos Configuration Manager PI CR ES C Fili Options Help IS am a Options Start Target Manager D Kalos 2 apps a Front Panel ME KALOS BIN Release y KALOS SYS D Tornado A amp E Shost x8B5 win32 bin Choose the Options button on the menu bar to modify configuration options A Customize options window is shown in Figure 65 Select Show Kalos Bin Directory to display the KALOS BIN pane on the Configuration Manager window Select Show KALOS_SYS to display KALOS SYS pane on the Configuration Manager window Add Application is used to select executable objects that are added to the applications list Each checked application on the list has its icon displayed in the Configuration Manager window Applications occurring within the Kalos bin directory are always matched with the selected Kalos home path If ShowBitz is selected from a Kalos home path then when the icon in the Configuration Manager view is clicked the ShowBitz application will start from the currently selected Kalos home path and KALOS BIN directory Delete an entry from the applications list by first clicking on the name to select it then click on the Remove button Rename an ent
401. n to load a file Open Workspace to edit an existing file Additional options are provided to save print close and review recent files Kalos 2 User Manual 59 3 Test Program Definition Figure 36 Program Load and Workspace x Kedit LoopCntr test ktl View Compile Tools Options Window Help at ae Wo Lane oe ee ee SE oe E LoopCntr_test ktl EB LoopCntr_tes File Name LoopCntr test ktl x SOCKET Created by P Madison 3 E Za CYCLE NAME Date 7 29 02 E fu CMODULE Description This test the loading of LoopCounters loop0 1 2 amp 3 co Eh PINGROUP i MAAALA ARAALE AAA AA RB CR TATA TATA AA AAT AAT AAA AAA AAA AAA AAA AA AAA AAA TAA TAA n n f CONSTANT gu Revision History 3b VARIABLE 7 29 02 File created a DPSSET H f PMUTEST LL AARAAERAARARA ARATE RATA AERA TRAE A AAA RAR RARE RARA ERA A AAA ARERR EAE Za LEVELS Include socket table and bin table E include socket 8 IO ktl ERREEERERERERARERARARARARARARARARAERERARARARARARARA zw C MODULES IATA RAE RARA RARA ERA RARA RARA RARA GR UR GR EN UN GA GN CMODULE pgRun c checkPgRun 0 Pf RARRAARAAAAAAAAA AAA AREA AAA A RATER AREA AREA AREA ERR ERT Lit CYCLE NAMES m RREEREREREEERERERERERERARERARERARARARERARAKAKARAKA To LOADDBM Po SEQUENCE CYCLE NAMES noop s a TEST AA AA s Bh FLOW Hs EDGESET f
402. nabled in Front Panel a In the Kalos binary files release tree search for FrntPanel ini b Bring up an editor to open the file suggested Notepad c Change the PP INTERACTWMAP to enabled the default is disabled Engineering environment must be enabled login required 3 Users must Start the program by way of dll then activate the Pause operation either from Devicelf or Summary Wafermap property page NOTE Loaded dll controls messaging and operations to the prober Chuckup Chuckdown and MoveDie 142 PN 071 0359 02 October 2005 KITE Software Figure 94 Interactive Wafermap E System Front Panel 101 File View Options Utilities Tools Help tala YA 5 5 E O Hs S 4508 a IStart IResume j 11 column 5 Sort 1 Soft 1 t 11 column 11 Sort 1 Soft 1 t 14 column 12 Sort 1Soft 1 11 column 6 Sort 1 Soft 1 t column 7 Sort 1 Soft 1 14 column 13 Sort 1 Soft 1 t 11 column 8 Sort 25 Soft 12 Ti columm 14 Sort 25 Soft 12 1 columr 9 Sort 1 Soft 1 14 column 15 Sort 1 Soft 1 11 column 10 Sort 1 Soft 1 11 column 16 Sort 1 Soft 1 num 03 46 10 PM a ASCII or Graphical Operations Wafermap can be output either in an ASCII format or a screen capture The entire Screen or a specified region of the window can be selected and captured to the clip board Images must be pasted to a separate application such as Paint The ASCII
403. name of the test to be executed The second column contains the name of the test or bin to be branched to when a pass result is received The third column contains the name of the test or bin to be branched to when a fail result is received 52 PN 071 0359 02 October 2005 Test Program File Figure 33 Flow Statement w Kedit Intel16M E File Edit View Compile Tools Options Window Help Ee en up 8 y AAAA AAAEEEESEEEEEEEEEEEEEEEEEEEEEEEEEEEEEEEEEEEEEEEEEEE EE YA FLOW s E FLOW PLATT TT RTT TT E Bitmap_CKBD_DENO flow Bitmap_AAAA DEMO flow Bitmap Bitfails DEMO flow Bituap Scanner DEMO flow FLOW Bitmap CKBD DEMO flow Shuoo Vlog DEMO flow test name pass branch fail branch Shuoo DEMO inflow Opens Shorts Bin2 dp All cest DEO Flow Shorts Erase array Bin8 Variables flow Erase array Read all ff Bin10 Eecroff testcase flow Read all ff Write CKBD Binii Read DBM FF DBM flow Write CKBD Read CKBD Bin20 ECR flow Read CKBD Read all ff ECR Bin21 Readffff flow Read all ff ECR Binl Bin25 BOF ecr ff flow J Compiler Output Find in Files For Help press F1 Ln 3327 Col Not connected NUM Program Files The KTL file contains various statement blocks most of which are given a unique name The following are brief descriptions of typical KTL statements These statements are possible parts that can be used in a test program run
404. nce and Root Mean Square RMS Median Finds the median of the TOS waveform and writes the results in the transcript pane wf Meas Functions The Wf Meas functions are DSP measurement functions that return numerical results SNR INL etc they do not alter any waveforms Wf Meas menu items and a description of each function are shown in Table 21 Kalos 2 User Manual 263 5 KITE Utilities Wf Meas Function Descriptions Table 21 Menu Item Ratios Ratios Kala ttit EffBits INL DNL ramp INUDNL sine IntermodDist Function This operation extracts the following functions from the TOS waveform RMS noise signal to noise ratio signal to distortion ratio signal to noise and distortion ratio magnitude of fundamental and DC offset The user is prompted for the following parameters when choosing this option Number of harmonics SineCurveFit Group Delay Negative one 1 is the default that tags all non aliased harmonics to be included in the total harmonic content SDR calculation This parameter allows for the inclusion of aliased harmonics in the SDR calculation that implies that they are not included in the SNR calculation The following results are written in the transcript pane RMS noise in dB Signal to noise ratio SNR in dB Signal to distortion ratio SDR in dB Signal to noise amp distortion ratio SNDR in dB Magnitude of fund
405. nchanged Menu Item Add Const Add Const Sub Const Sub Const Mult Const Mult Const Div WfiConst Div Wf Const Div Constr Div Const Wf Clip Const Sica Clip Bipolar pha Shift Const Boolean Clip Bipolar X Offset Norm cas Shift Const Boolean X Offset Norm Abs Wf Arith Functions Wf Arith menu items and a description of each function are shown in Table 17 258 PN 071 0359 02 October 2005 Table 17 Sub Mult Div Clip Reverse Waveform AWT Wf Arith Function Descriptions Menu Item Add Function Adds the magnitudes of the TOS and next TOS waveforms together Places the result on TOS Original waveforms are deleted Sub Subtracts the magnitude of the TOS from the magnitude of the next TOS waveform Places the result on TOS Original waveforms are deleted Mult Multiplies the magnitudes of the TOS and next TOS waveforms together Places the result on TOS Original waveforms are deleted Div Divides the magnitude of the TOS by the magnitude of the next to TOS waveform Places the result on TOS Original waveforms are deleted Clip Clips the TOS waveform by the next to TOS waveform that is does not let the magnitude of the waveform go above the value in the next to TOS waveform The TOS waveform is replaced but the next to TOS waveform is left unchanged Reverse Reverses the indexes of the TOS waveform that is the fi
406. nctions 0 0000 cece eee 257 Shell Dialog METTI 278 Stack Menu 2 ees 279 Waveform Registers aa 280 File MENU 2 2 I n 281 Creating a Script Dialog BOX nanan auaa auaa aaa 281 Execute Script Dialog BOX aaa 283 Transcript Pan with Drop Down Edit Menu 284 Shell Command Dialog Box 0a 285 Exit Dialog BOX 0062 star e 5 ees e ee oaek Wee d 298 BD Urol PLU 299 LDTool Window sasaaa aana eee 300 Vector Data Shown by Device Pins 301 Device Pin Numbers Shown With Names 301 Falli PaaS Serene dura RARIUS ante atate RT Ra 302 Fail Channel Pins 00 e eee 302 Row and Column Selection 00000 ee eee 304 Cell Selection ces 305 Channels Dialog ociosa GA KAKA KAKA CR co RR dece 306 WaveForm Window 200000 cee eee eee 307 Change Scale Dialog lt o lt oooooooooocornmm 308 LATool Window isses eee 309 Settings Dialog lt gt curse EO b etae Y S Pe dube 313 DSTool Window 00000 cece 314 Datalog Window scx cata kod cakes ORDRE UR eee ee NEL 316 Resouce Selection cee eee 317 Selection of Radix 0 0000 eee 318 Data by Channels te caspa pakana NAA AE Khaak 318 Data by Device PING i cxa awa crure sa reas Re bake kik wee 319 TG Field Context Menu 2 319 xvi PN 071 0359 02 October 2005 Contents Figure 185 Brief Mode 25 a Ra irc een dl
407. nd correlation 2 Wafer probing Portion of a pad on a die taboo to a probe During a probe mark inspection probe marks encroaching on the guard band are counted as bad Graphical user interface A Kalos system with 16 boards installed in the test head The representation of numbers in the positional number system with base 16 The sixteen hexadecimal digits are usually represented by 0 9 A F Kalos 2 User Manual 545 A Glossary of Terms 1 O channel inhibit Kalos KBI KITE KNET KPC KPL KTC KTL LAN level ASIC library An input output tester port that is capable of both stimulating a device pin and monitoring a response from the same pin To turn off a driver placing it in a state that approximates an open circuit Name of test system however the word itself is a greek word for beauty usually applied to masculine objects It has overtones of usefulness Kalos test program binary interface This is the executable test program file with file name extension kbi The Kalos software environment An acronym for Kalos interactive testing environment Kalos network software functions and code Kalos pattern compiler Kalos pattern language Kalos test program language compiler Kalos test language Local area network One of several custom CMOS chips on the Kalos The Level ASIC contains six tester channels worth of sample and hold circuits for controlling pin levels VIH VIL V
408. nd that summary and datalog information are reported back to the user These functions include all typical operations required for the user to run a test program and interpret the results NOTE A password is required to enable Engineering application modes non production Kalos 2 test systems are provided with a default password This password appears in the Tester ID section of the Header panel on the Engineering property page 108 PN 071 0359 02 October 2005 Front Panel Interface Figure 71 System Front Panel Window Default View Menu bar Toolbar gt Control area 7 Lm jme ms ma ms na mz ma ms mw mu mo ms mw mw mw Function keys 4 Property page tabs 4 Header area Bin results by slice View area NOTE Slices can be activated or deactivated on the Overview and Engineering property pages Kalos 2 User Manual 109 4 Introduction to KITE Kalos 2 Integrated Test Environment KITE Software The Kalos Integrated Test Environment KITE software provides access to development debug and diagnostic tools and utilities through a graphical user interface Starting KITE The launching of KITE software is part of the start up procedure for the Kalos 2 test system The user must invoke the KITE software in order to launch the System Front Panel application or the Kalos 2 Configuration Manager The default condition of the KIT
409. ndependently maximizing throughput for non deterministic parallel test flows Handlers and probers are accommodated by design with program loading and central control by way of a workstation computer Performance features include a 100 MHz basic test rate per DUT redundancy analysis per DUT AC and DC test Kalos 2 test systems have the capability to test all future sizes of memory peripheral logic and memory arrays of up to terabit data size and I O pin counts in multiples of 96 to 768 I O pins The test head with four modules provides 36 independent test systems each with 96 I O pins for a total of 3456 I O pins Each of the I O pins has individually programmed tri level voltages current loads and comparators Each of the possible 36 Kalos 2 test systems in a test head has two dedicated central processing unit CPU Modules ETX As a result Kalos 2 has none of the test overhead and restrictions of shared resource architecture test systems where all devices must wait for the slowest device or when serial binning is mandated With 36 x 96 pin or 72 x 48 pin DUTs simultaneously tested asynchronously in parallel this sequence independence means each DUT is tested with maximum throughput Each 48 I O pin tester slice has its own CPU module error capture RAM ECR and data buffer memory DBM for compatibility with existing Kalos 1 programs It is possible for one tester controller to control up to four tester slices In addition w
410. ned Start Continue Test Starts or resumes testing after a breakpoint Step over Execute the test element at cursor location Step into Execute the test element one level below cursor location Step Out Execute until next test element one level above cursor location 12 Clear All KTL Breakpoints Remove breakpoints from all lines in test program Clear All C Breakpoints Remove breakpoints from all lines in C file Stop test Stops the test List of active modules The first step in debugging is to select the Kalos 2 master slice where debugging is to occur Using Debug Tools To debug a test program using Kedit debug tools proceed through the following steps 1 2 3 Compile the test program workspace Click the Online Offline icon on the Debug toolbar Select the module to debug on from the List of active modules on the Debug toolbar Click the Load Project or Load Program icon on the Debug toolbar to load a kpj or ktl workspace Kalos 2 User Manual 75 3 Test Program Definition 10 11 12 Select the Flow to run from the variables window at the bottom of the Kedit window see Figure 42 In KTL position the cursor on a line that contains a sequence action a CONFIG EVENT MAP or the Flow line to break on and click the nsert Remove breakpoint icon on the Debug toolbar to set the breakpoint In C code position the cursor on a valid line of C code and click the nsert Remove
411. nguage chapter of the KITE Reference Manual for additional information definitions and examples of variables NOTE The maximum amount of variables and constants available to users is 2048 on a Kalos 2 tester On a Kalos 1 tester the maximum amount available is 1024 Figure 245 Cons Vars Property Page EN Test Debugger Application DER File Utilities Tools Help TE Program ifh_demo Flow Shmoo Viog PinMon DEMO flow Vana Senta ee i Gt K2 Overview Socket Sequence Levels Timings DPS PMU Con Var Misc nvm pat Item Constant Name Definition Text Value CElec Locate gt gt gt Item Variable Name Definition Text lt tab gt Value CElec 0001 Tl OE RD 135ns 0002 Taccess Ons 0003 TZ CE RD 250ns 0004 Tl DBUS RD 165ns 0005 Tl ADDR RD 100ns 0006 T2Z DBUS RD 210ns 0007 TZ ADDR RD 250ns 0008 PassLowVcc 0 0009 XZ EH 0 0010 TZ OE RD 250ns 0011 DATE 8132003 0012 speed bin 1 0013 TIRE 10500017 0014 Vdd set 3 00V 0015 Tl CE RD 100ns om NJN f e ela ale lola RIS e e e n els BIS B e al wim jaja o e CI Test Debugger Messages Breaktrap Misc nvm pat The Misc nvm pat property page displays NVM loadboard data and pattern statement fail modes of which can be changed by way of the Patterns tab Kalos 2 User Manual 447 6 Test Debugger
412. nitor monitors the electrical state of the tester system in terms of voltage current and temperature readings The System Monitor utility is launched by clicking on the System Monitor icon see Figure 222 or it can be selected launched from the Utilities menu item Figure 222 System Monitor Click here to open the System Monitor utility HE Ha Cis es an Ble AAA The system monitor is started automatically when the Kalos 2 test system software is started i e Ttarget Kalos 2 server It exits when Ttarget Kalos 2 server is shutdown Normally the System Monitor runs silently in the background monitoring conditions in the test head If an abnormal condition occurs the System Monitor notifies Front Panel which updates its message box in the top center of the program If a serious problem is detected the test head the System Monitor can shutoff the test head power to prevent damage to the Kalos 2 test system hardware If this occurs Front Panel displays the message Shutdown in the main message box A service technician should be called to investigate and correct the problem before system operation is restarted For additional information about the System Monitor refer to the online System Monitor User s Guide This user guide can be viewed by opening the System Monitor program from Front Panel and clicking the Help button on the toolbar Kalos 2 User Manual 417 5 KITE Utilities MAP INIT The MAP INIT selec
413. ns Script b Shell Prompt x Shell Command fy Marker Title on ac gasa caen Executing Script Files A Closer Look A command interpreter is built into the Waveform tool It allows script files to be executed to perform operations that are normally performed manually These script files have the suffix aws or cmd When the editor starts up it performs the following script file related operations Opens a file named 1og aws Most commands executed during a Wavetool session are written to this file A different file can be specified using the script on name lt string gt command or from selecting the menu item Tools Script Record or by clicking the Begin Script Recording icon in the toolbar If the file cannot be opened an error message is printed in the transcript pane section of the Analog Wavetool window Looks for a file named awtinit cmd and if it exists interprets the file The local directory the directory from which the Waveform tool is invoked is checked first then the users home directory and finally the directory specified by the AweD DEFAULT DIR environment variable Kalos 2 User Manual 285 5 KITE Utilities Looks for files with the aws or cmd extensions and assigns the found files to the user function buttons By default the Documents and Settings1susername folder is checked This can be changed at Tools gt Options gt Default Locations If a bu
414. ns of DE EXE 388 Example Code Listing iud ior m ERE b RR RO Ra E RES Rd KAWANG 404 CIBC MAT PUTENT 410 SNOW TINI ooi uoa dada n ded dedica erdt 411 ShowBitz Interface lll 411 Navigator sea d eacehon ie emn x Rea E EEG AP E ER ee ORES 413 Channel Views sess 413 Omni Views 2 es 413 Slice VIEWS i ces EE na ate a RE Ha KALAN De abd do 413 Register A 413 Protected Views ees 414 Shortcuts VIEW 6 ag ke a CERE RUN RONG E OE UE E 414 Toolbar AS 414 Send VIEW iode haa dad Pe BING ERU RE ead i ede dd eR aa 414 Message WINDOW c caisse ne kee olde a ea a Wa oe KA pied cR OR Cc ccc Bee 414 Kalos 2 User Manual ix NVMDIB Rae RR AR GER Read de RR BAGAN KG Reach AB EA RRA REARS 416 System MONG cc Semen wet ose 3 Sonico nbl os d ye ee heed a receta anon dl caca 417 MAP INIT eT ETT 418 Test Debugger 1 2 c6cx arp RR UID PEE TREE RESP ERG wee ees EAE RE 419 Introduction i ie ta oe ee Rein Ce e a OR a dc a a t e a c 420 Graphical User Interface llle 422 Test Debugger Application 2 0 06 ee e IRR nn 423 Primary Window Overview Functions 2 425 TOMA MC EDT 427 Property Page Functions iixewteddskeesaci eae e REESE ERE pd 428 Overview Window sss 428 Socket ick eso cca a a aR ES Raa Rak ea Re c 429 SOCKELFIIC a arasa od be tme Re tied ac GEL QE ee oe ea ede 429 PACKAGG Drm 430 le Dm 431 Bin Table 0 0 2 eitig aaa e aR ns 431 Flow Tablet LETT 432 Flow NGO pao aci
415. nual Operators Safety Summary Terms in This Manual Terms as Marked on Equipment Symbols as Marked on Equipment Power Source and Ground Do Not Remove Covers or Panels Do Not Operate in Explosive Atmospheres The general safety information in this summary is for both operating and servicing personnel Specific warnings and cautions will be found throughout the manual where they apply but may not appear in this summary CAUTION statements identify conditions or practices that could result in damage to the equipment or other property WARNING statements identify conditions or practices that could result in personal injury or loss of life CAUTION indicates a personal injury hazard not immediately accessible as one reads the marking or a hazard to property including the equipment itself DANGER indicates a personal injury hazard immediately accessible as one reads the marking DANGER High Voltage IM ATTENTION Refer to manual D Protective ground earth terminal This equipment operates from a power source that applies dangerous voltage between the supply conductors and between any supply conductor and ground If the ground connection is interrupted all accessible conductive parts could render an electric shock If a power cord is not provided with the product refer power connection to qualified service personnel To avoid personal injury do not remove product covers or panels Do not operate the product
416. o 10 maps each map has a parametric or functional component USER MAP 2 300 USER MAP 2 WIDTH 6 USER MAP 2 NAME Test number 300 USER MAP 2 FMT 1f The is required for the width to work USER MAP 2 MULT 0 Summary Local Settings LOT FILE EXTENSION sum Lot summary file extension PROG FULL PATH True Can be True False 1 0 Option to put the full path of the test program in the summary files LSUM SITE INFO True Can be True False 1 0 Option to put the test program site information in the lot summary files SITE LETTER S False Can be True False 1 0 Option to indicate site by letter S instead of K PHYS SITES False Can be True False 1 0 Option to indicate a separate summary for each module and phys site 372 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine Shmoo Local Settings FILE PER MODULE False Can be True False 1 0 Option to create separate shmoo file for each module CVIEW FORMATTING true Can be True False 1 0 Option to use formatting for shmoo headers like in CVIEW HIDE FILE HEADER true Can be True False 1 0 Option to hide standard file header of files generated by DE HIDE_TEST_INFO true Can be True False 1 0 Option to hide sender test information for stings sent by TPEDatalogPrintf if FILE PER MODULE option is enabled Kalos 2 External Datalogging Overview DE saves testing results in seve
417. o example kpl shnoo fast example kpl DEM ECR example kpl read 5678 ECR kpl read ECR fast x kpl read ECR fast y kpl ckbd0 ECR kpl ckbdl ECR kpl Flag reg kpl Flag reg for showbitz kpl cRam example kpl neas cap kpl scope kpl BOC EOC load control kpl BOF_AOF kpl vihh kpl yui bup abi kpl Program E Files Navigating while using the toolbar see Figure 38 provides the user with options to perform functions that can be performed using pulldown menus The Kedit toolbar consists of four sections Standard Tools Bookmarks Anonymous Macros and Debug Tools 64 PN 071 0359 02 October 2005 Kedit Figure 38 Toolbars x Kedit multi dbm ktl File Edit View Compile Tools Options W tel 1138x78 um Ss DES Sew TEREA 142 Klean USAD SA SAP aera J ON Y Standard Tools Anonymous Debug Tools Bookmarks Macros w Kedit k2 timing ktl File Edit View Compile Tools Options Window Help HAAAY 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 SEs eunub t 20 21 22 23 24 25 26 27 28 29 B8x SQ OSHA S MARP OEY el 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 Standard Tools These tool icons perform standard functions found in similar applications These functions include file operations such as open and close edit operations such as undo and redo and project operations such as compile and build Bookmarks These
418. o o o 0 o o 50 13 13 1 lilolo z L r c o a o d o co o o o o 51 14 13 1 jolo zlo x e o o o o o o a o 0o o o 52 15 13 i lilolo r r c o a 6 a o 0 0 6 0 6 53 16 13 Q1 obol X Ff Cc Oo 0 0 o 0 0 o 0 0 o 0 o 54 17 13 1 jilolo X fh s c o o d 0 Gd d o o 55 18 13 i olo zli c o o 0 0 0 0 o 0o 0 0 o 56 19 13 T ool x 1 F C 0 0 0 0 0 d D 0 o 0 o0 o 57 20 13 1 lolo x m 6G Cc o o o oO o o o 0 0 o O0 89 Sam FAIL SUMMARY P P P P P P P P LDTool LATool DSTool Datalog Ready WCD 96x4 ONLINE patlwm96x4Y6 If a vector data of some vector and pin is shown with gray background and red border ET it indicates fail fixed for that data The headers of the CHANNELS DEVICE PINS columns are provided with the following context menu 302 PN 071 0359 02 October 2005 Channels Show channels v Show device pins Show names Show Fset Show Tset Show Repeat Show STY Show SYNC Show IGNF Show PF A X X amp C 4 Show Address Show Vector ID Logic Debug Tool Displays the Channels dialog for selecting the channels to be shown Shows the current vector data by channels if checked Shows the current vector data by device pins if checked Shows the names of channels or device pins if checked Check uncheck these items to show hide the corresponding data columns User can select any row in the LDTool window by clicking that row and or select columns by clicking their headers For bett
419. ocatable data In this case the fixed descriptors represent re locatable values Look for RELOC to appear for both MEM A and MEM B to indicate this usage The DRAM SRAM Viewer property page see Figure 100 lists the entries in the DRAM by filename the table is updated The following provides a description of each column in the DRAM entry Filename Represents either the DBM or pattern filename defined by a test program resource Only LVM or Scan pattern data is stored in the DRAM Algorithmic pattern data is stored in the CPU memory on the ETX board DRAM fixed offset fixed size The fixed offset is used for DBM or Scan data that always starts at a fixed address in the SRAM The fixed size is count of rows allocated in the DRAM Kalos 2 User Manual 155 4 Introduction to KITE Kalos 2 Integrated Test Environment DRAM reloc offset reloc size The re locatable offset is used for LVM data that can have any starting address in the SRAM The reloc size is count of rows allocated in the DRAM SRAM fixed offset reloc offset SRAM Status SRAM Row Start Row End Resource Since each entry in this view can have both a fixed and re locatable component the offset to the start row of fixed component appears first followed by the start row of the re locatable component in parentheses Unused components have a default value of 0 Refer to the SRAM Status to determine whether a component is in use This field report
420. ode 4 HEX file selection 5 Optional header entries NOTE Refer to the Device Testing Procedure section of this chapter for additional options when loading a project file Kalos Active Slices Banks A B C D can be viewed on the Front Panel The buttons below the text Active Slices correspond to the Kalos 2 boards found in the system Banks corresponding to the slices physically attach to the various backplane boards in the test head On a Kalos2 tester these begin with slice AO Bank A Slice 0 and display up to D71 Bank D Slice 17 Once a program is loaded slices that have a valid program load appear blue Invalid programs appear red 104 PN 071 0359 02 October 2005 Loading Test Programs Projects in KITE Figure 69 Project Program Loading System Front Panel Load options file pulldown menu Load buttons Lookin m de e eE a dbm hex multi_dbm ckpl a xfer_dbm pbi E dbmB hex E multi_dbm kbi E xfer_dbmLabels h E dbmC hex EJ multi dbm ktl E EdgeSet block txt multi dbm opd E k1_timing ktl EE vssver scc EB k2 timing kti E fer dbm kpl File name LoopCnir test kbi Files of type Ail Files 7 y Cancel Kalos 2 User Manual 105 4 Introduction to KITE Kalos 2 Integrated Test Environment Test Program Load Setup This section provides a basic overview of the Kalos 2 program load procedure Embedded in th
421. of the datalog file stops when reaching this limit Creation of test result files STDF wafermap etc continues Setting this limit above 50 percent of the total hard disk free space is not recommended BINARY ROTARY False Can be True False 1 0 When true remove oldest datalog binary file in user directory when hard disk space limit is reached KDX LOG DUMP FALSE Can be True False 1 0 In the DE and data DLLs there may be many kdx printf statements which work like printf C statements for the text output This information appears in the DE settings dialog if this parameter is true This can be used for the debugging of custom user DLLs refer to Collecting Log Files for Debugging DUMP DIR 0OUTPUT_DIR Directory location for kdx printf debug information when KDX LOG DUMP TRUE DIB NVM INFO False Can be True False 1 0 Option to include DIB part and DIB serial fields into the wafermap summary and shmoo files The data are read from NVM on the Kalos board and also displayed in the Overview section of Front Panel PROCESS RETEST False Can be True False 1 0 Option to take into account die retest to never have die counters over the real gross number of dies This has an effect on all die counters including e Counter values returned by Data Engine API e Counter values summary files e Counter values in PCR TSR HBR SBR records in STDF files Kalos 2 User Manual 367 5 KIT
422. off click the Superimpose Off button The button returns to its original form and superimposition is removed Clear Superimpose Clicking this button clears all superimposed waveforms even those that have scrolled off the display Navigating the Waveform Graphic Pane Waveforms are displayed in the waveform graphic pane section of the Analog Wavetool window see Figure 139 This display is divided into waveform panes each displaying one waveform Other options selected by way of the View menu are reflected here as well 244 PN 071 0359 02 October 2005 Waveform AWT Aside from cursors which can be used to modify waveforms there are two primary ways to navigate around the graphic pane Zooming Scrolling Zooming Zoom in on a region of a waveform patch using the custom zoom capability To define an area on which to zoom 1 Choose the menu item View Custom Zoom or click the Custom Zoom icon magnifying glass or click in the center and drag to select a region Click and drag diagonally to specify the area to zoom 3 Release the mouse button The X and Y positions and scale factors are updated to cause the selected region to fill the patch To return to the default state of the patch waveform unzoomed Choose the menu item Edit Undo Custom Zoom Scrolling Scroll a waveform along both axes Scrolling Along the Y Axis Scrolling Along the X Axis Scrolling Along the Y Axis If a
423. oft bin information to the Wafermap through the result packet The results packet resides in KNET Kalos network software functions and code as shown in Figure 90 The Wafermap has no control over the prober or the tester as it is a read only tool NorE In automatic mode you can start or stop the test from the prober or the tester Otherwise the test stops when the executable Kalos test program kbi is completed Kalos 2 User Manual 137 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 90 Wafermap Functional Diagram Binning Information Device IF Result Packet coordinates contains the X Y coordinates and Prober binning information The Wafermap displays pass fail results or sorted die categories of selected wafers plotted within a two dimensional coordinate system Basic features include Mask Editor and Generation Data Evaluation Mode e Composite Modes Graphical Operations There are two functional operations available on the Wafermap Sort Results and Mask Editor The basic top level window see Figure 91 of the Wafermap is subdivided into multiple view or control areas these are Control Area Execution control and mode selection Viewing Pass fail condition die number and row column position Summary Standard wafer summary report 138 PN 071 0359 02 October 2005 Figure 91 Control area Viewing Summary 4 Status area gt
424. ogram ifh_demo Flow Histograms_flow Test Opens Histogram Slices Bank A Histogram Slices Bank B Histogram Slices Bank C Histogram Slices Bank D imp III ILL LLL BB ERE Cell Defintions Reset Index Counts E Cells 33 3333mV av 966 667mV 933 333mV 866 687mV 833 333mV BOYGARONSO 800m 766 667mw 300mW 266 667m 233 333mV 200m 166 667mV ooooooocoooocofo oBoooocoooooocoo Cell Counts DEBNCIBECIRI a EIE VUNNNNNNNNNN a e mm e o AEREA y SEQ CQ 5 6 8 9 10 1 172 13 14 jm Print Selected FrontPanel Messages 10 42 43 AM NOTE You cannot change formats with the ASCII Datalogger The Datalog saves by events or by slice Kalos 2 User Manual 149 4 Introduction to KITE Kalos 2 Integrated Test Environment Example Printout of a Datalog File The following is an example of a datalog file printout Tester ID op id Date July 31 1999 08 46AM Program program name Device device type Flow flow name Serial 5 Kalos 0 Lot Alpha numeric Operator user name Comment comment Users C user message Test 100 00 01 Contact 100 00 84 Contact chook dprint1 result message Test Mdl Site PS Pin Grp Test Description Force Range Measure Range Max Min Pass Fail 100 00 01 AO Contact 100uA 250uA 500mV 12 5 V NA 1 V PASS 100 00 01 A1 Contact 100uA 250uA 500mV 12 5 V NA 1 V PAS
425. ojojo oioinaioioioioioiaioioiloioioaioioioioioio mm oioioioioio ioioioioioioio ioio oioioio io oioioio oio oio oioio o olo io oioioio o oioloioioioioioioloioloiolioioloio oloio oioioio oio oioioioioio lo oio 0 00 00 ojojojojojojojojojojojojojojojojojojoja oioioioioio ojo o o o Did o o o o ooo oioioioioio ioioioio oioio oio oioioio oj ojo jo ojo ojo o o o o io o io o io o loo oioioioioioioio ioioioloioioio oioioio o oioioio oio oioioioio o ooio oioioioio oioioioloiojoloioioioloiojoiojoio jojolo CD DD DDD Did Did Did Did oio oooO N o FAIL SUMMARY x x x x x x x x x x x x x x x x x x x x x LATool DSTool Datalog VCD 96x4 ONLINE patLvm96x4 6 Select the application mode Pattern data is displayed in a column format The following data is provided column information noted as editable can be edited Addr Pattern address in SRAM Vector ID Sequential number of the current vector in the kpl file FSet Format set TSet Timing set Rpt Repeat counter editable STV Store This Vector 1 sets the current vector to be stored in History RAM editable 300 PN 071 0359 02 October 2005 Logic Debug Tool SYNC editable IGNF Ignore fail 1 sets the failed address to be shown in the LDTool window like the addresses with no fail are shown editable P F Pass Fail X if there is no information FAIL in red if fail occurred Pass in green if passed without fail CHANNELS DEVICE
426. ol Figure 190 List of Active Modules ENANA D To change the active module user must clear the currently loaded data maala A a Eli 22 Find HL HH LL H gt E Goto Save Dialog The Save dialog allows users to specify which data of the LDTool window is to be saved and save it as a vbd file Figure 191 Figure 191 Save Dialog Window Look in My Documents vio E e E3 i My Music my Pictures 1 vbd Untitled vbd File name vbd ptions r Columns Channels SRAM Address Dec y Y STV C VCD C Current lv Vector ID Hex M SYNC Selected IV Fset Dec M IGNF Format IV Tset Dec v M PASSSFAIL KPL SRAM IV Repeat E m Save Block From 3 To 314 Use Sram Addresses 3 314 Cancel SAVE Kalos 2 User Manual 327 5 KITE Utilities The following describes features of the Save dialog window Columns Sram Address Block Channels Format Check uncheck the check boxes to select the columns to be saved along with the desired radices if available Specify the desired address block by typing the numbers of the first and last addresses of the block in the From and To edit boxes correspondingly The whole available address range is indicated below Use Sram Addresses VCD saves all channels in the same order as in the pattern file Current saves the channels currently shown in the LDTool window
427. olls right on the waveform s in very small increments To fit a waveform to its patch 1 Right click in the patch that contains the waveform to be rescaled 2 Choose the menu item Fit to Window NOTE Waveforms with the same units as the one being rescaled are also rescaled Annotating Waveforms Markers Type Markers consist of four parts Type Location Label Data A string that specifies the type of the marker Several markers of the same type can be defined at different locations Each instance of a particular marker type has its own location label and data Location The X and Y coordinates define the location of the marker with respect to the waveform These coordinates are in the same units as the waveform If the waveform data X units is seconds the marker X coordinate is in seconds If the waveform Y units is volts the marker Y units is volts Kalos 2 User Manual 247 5 KITE Utilities Label Data In the Waveform tool markers are sorted by X coordinate If two or more markers have the same X coordinate they are in the order they were defined A label is a string that contains information about the specific marker In many cases the label contains all the necessary information for a marker In other cases the label is used to specify variations on a marker type Data can represent any number of integers doubles or strings Each data item is defined as a label value pair a string
428. om the specified Kalos 2 slice and its respective hardware 524 PN 071 0359 02 October 2005 Bitmap Set ECR Data via Mode Selected Set the application s ECR data to the specified Kalos 2 slice and its respective hardware width mode only Import Setups Saves all current setup tables to a file without deleting the setup tables csp Export Setups Deletes current setup tables and reads the selected file setup tables into the application csp Read bfm Opens a binary file with bfm extension and reads the Socket Definition and the ECR data into the application Write bfm Saves selected Socket Definition and the ECR data to a binary file with bfm extension Bit Image File bfm reader Opens a previously created bim file Exit Close the tool and all windows associated with it NOTE The bim file is a KTL generated file type used for bitmapping either KLA third party or Kalos 2 Bitmap application Toolbar The Bitmap toolbar is an arrangement of graphical buttons that when clicked send messages as do menus and keyboard accelerators for requested functions of the Bitmap tool Below are definitions for the toolbar buttons see Figure 302 Import Setups same as the above File menu definition Export Setups same as the above File menu definition Read bfm same as Read bfm above File menu definition Write bfm same as Write bfm above File menu definition Read Bit Image
429. on 9 Property page tabs Functional page selection functional operations interface controls display tables charts and graphs timing information and system monitoring 10 View area Views for selecting specific overviews with their respective components Graphical views are available when required 11 Status bar Displays messages and status Figure 227 Overview Primary Window COE Ed Test Debugger Application WE i 6 mun a UT est FEE RUE EdgeSet K2 DPS Patterns pat_DQ3 Sequences m v tfo 426 PN 071 0359 02 October 2005 Test Debugger Application Toolbar The Toolbar is an arrangement of three graphical icon buttons that when chosen execute commands These buttons contain the most commonly used commands of the pulldown menu bar The Toolbar comprises Save As Print tbugger ktl and About buttons that when clicked send save and print commands as do menus and keyboard accelerators for requested functions of the Test Debugger utility or display software version information The following are definitions for the toolbar buttons shown in Figure 228 a SaveAs saves the current debugging binary file kbi to a specified ktl file The selected file ASCII text is the entire program de compiled from the binary file that is currently loaded No comments are saved with this command b Print tbugger ktl allows the user to print a hardcopy of the currently selected
430. on on the current shmoo plot conditions and allows for the selection of pass skip or pre defined variable setups Pass Skip Number X Select Y Select Controls the skip datapoints between pass points along the X axis This results in faster execution in the pass region as a specified number of datapoints are skipped A boundary shmoo plot is generated when the pass skip number is greater than or equal to the number of X axis steps This field allows the user to choose from a list of pre defined axis variable setups Left mouse click in the white area to view the list This field allows the user to choose from a list of pre defined axis variable setups Left mouse click in the white area to view the list 462 PN 071 0359 02 October 2005 Setting Up the Shmoo Plot Z Select This field allows the user to choose from the list of pre defined variable setups Left mouse click in the white area to view the list The Z Select option is activated when 3 D Shmoo is selected Start Value The axis start value x y or z displayed on the shmoo plot Index Value The axis index value x y or z Size of step increments as shown in the shmoo plot The index value is independent for print and tracking values Steps Total number of steps increments on the axis The example in Figure 253 illustrates a 2 D Shmoo plot with the pass skip set to five Figure 253 Pass Skip Example Lr mai Kalos 2 User
431. on unless otherwise instructed Instruction Action Click Click the mouse button once Select Choose Click the mouse button once on the referenced item so that it is highlighted Right click Click once with the right mouse button Double click Click the mouse button twice rapidly without moving the mouse Shift click Hold down the Shift key and click the mouse button xxvi PN 071 0359 02 October 2005 Related Publications Related Publications The following Credence publications are currently included on the Kalos 2 Series software that is shipped with each system Kalos 2 User Manual This manual Part Number 071 0359 xx Kalos 2 KITE Reference Manual Part Number 071 0455 xx ShowBitz Help Online Reference Manual NVM User s Guide Device Interface Board System Monitor User s Guide These online help documents are available in PDF format on a CD ROM that can be read with Adobe Acrobat Reader Refer to the following directory path C Kalos2 doc kpl or ktl make a shortcut to easily access this online documentation Direct Kalos 2 KITE Reference Manual access is provided from the Kedit utility Help menu Also refer to the Online Help Documentation section of this preface The following Kalos 2 manuals and guides are available on the Kalos 2 Documentation Set CD part number 063 4790 xx Kalos 2 User Manual Part Number 07 1 0359 xx Kalos 2 KITE Reference Manual Part Number 071 0455 xx Kalos
432. ons are met box in the History Ram Control dialog shown in Figure 51 Some of the conditions that can be used to arm and trigger are 1 Fail occurs 2 A URAM address is executed 3 Any counter reaches a condition value 4 Any combination of the above logical AND combination Arming on the first cycle and triggering on fail is the commonly used setup for a datalogger Separate arm capability allows users to delay triggering to a URAM or cycle that occurs later during the burst possibly after many other fails have occurred Arm amp Trigger This Line Sets Kedit to begin storing in history RAM at the current line and stop storing N cycles later by programming a value to the number of cycles after arm amp trigger Arm First Instruction Sets Kedit to begin storing in history RAM at the first instruction of the pattern Trigger First Instruction Sets Kedit to pass N cycles then stop storing in history RAM after the first instruction Trigger ON FAIL Sets Kedit to pass N cycles then stop storing in history RAM after the first fail occurs Storage Mode Provides the following mode selections e Store All During each tester cycle all of the PG TG data for that cycle are stored until an arm and trigger occur followed by the number of cycles specified in After Arm 8 Trig Kalos 2 User Manual 83 3 Test Program Definition Store This Vector This mode allows condition test cycles to be captured in the history RAM und
433. ons window Line Basic dot to dot mode where each data point is connected by a straight line Points Displays only the data points Sample Mode Imitates a DAC output In this mode the display magnitude does not change until the next data point Histogram A basic bar code chart centered around zero Display Mode The Display mode for the X axis in the Options window has two choices User Units or Points User Units Displays the X axis in terms of user interval units sample interval If user interval units are seconds display is in the Points time domain User Units Points Changes all X axes to Points mode samples per division In User Units mode the waveforms are displayed at the same scale if the units are the same In Points mode units are ignored This means that in user units mode a single cycle waveform sampled at 5 ns intervals with 800 points graphically looks the same as a single cycle waveform sampled at 10 ns intervals with 400 points In Points mode however the first of these two waveforms are displayed at twice the width of the second Graticule Setting To select the type of graticule in the Options window when displaying with a waveform patch 1 Choose one of the following four types Cartesian Sets the scales for the X axes at the bottom of the waveform patches Scale Sets the scales for the X axes in the center of the waveform patches as is Y axis label
434. or editing and the light gray areas are not available for editing Three views are available on this page Bin Table Flow Table and Flow Diagram Bin Table The default view The current Bin file is viewed here This table represents the bin conditions made up of a bin name Sort Kalos 2 User Manual 423 6 Test Debugger Test Sequence Levels Timings DPS PMU Setups Cons Vars Misc nvm pat Hard Bins Counter Soft Bins and PASS FAIL Designation Flow Table Allows for editing of the Flow Table of the loaded program white areas only Flow Diagram A viewer that combines the Bin and Flow Tables and integrates them into a flow diagram The selected test slice which is determined by Select Test or Break Test pointing to the highlighted text field displays the overall block components or the element editing for the test components The editing also includes the test identifiers and the sequence elements Any modification to the test enables the Set button yellow which the user must activate if the modification is to be invoked in the program In a similar manner to the Test property page the Sequence page allows the user to edit the Sequence elements Allows for modification of all level values by either selecting an element from a pulldown list or by editing the text field Allows for modification of all timing values by either selecting an element from a pulldown list or by editing th
435. ore than one slice and the ability to control from one to sixteen slices The ETX uses 100 Base TX Ethernet connections to the host computer 18 PN 071 0359 02 October 2005 USER OPERATIONS This chapter describes the operating environment and provides information on the following user operations Basic System Operation Logging On Off and Shutdown e Working With Files and Folders in Windows XP Kalos 2 User Manual 19 2 User Operations Operating Environment The Kalos Integrated Test Environment KITE software operates on the Kalos 2 workstation computer an Intel Pentium9 processor based system The user interface is implemented using the Microsoft windows XP9 operating system The KITE software provides access to development debug and diagnostic tools and utilities through a graphical user interface For the purposes of this manual it is assumed that the user is familiar with the Microsoft Windows operating environment including its commands and system file structures The following section contains a short description of the Windows XP interface controls that are referred to in this documentation Networking Kalos 2 operates stand alone or connected to other computer systems on a network that support Ethernet and TCP IP protocol The network provides a flexible test environment allowing program development and the tester data base to be hosted on different computers within the network PC Requ
436. orner of the Analog Wavetool The data is printed in the same color as its corresponding waveform Figure 157 Stack Menu pm Analog Wavetool File Edit View Tester Store Recall Tools Help Main Menu bar ee yr NOIA 0 sino RRECT 1024 100 0000ns uv Clear Stack The stack index number shows the relative location in the stack of the waveform The index of the top of stack waveform is zero the next to top of stack waveform has an index of one and so on A following the index indicates that at least one cursor is attached to the waveform The letter S indicates that the waveform is superimposed on the TOS waveform The waveform name is listed followed by the type R is a real rectangular waveform Cr and Ci are complex rectangular waveforms with the real or imaginary component displayed Pm and Pp are a polar waveforms with magnitude or phase displayed The number of points in the waveform is displayed next followed by the sample interval and vertical units For waveforms currently connected to a tester additional information is displayed The tester read mode is the current read mode Read Auto Update or Retrace The command file identifies the command file that is currently specified and enabled If a command file is specified but not enabled no command file is listed in the stack display To clear the stack Choose the menu item Stack Empty Stack This removes all waveforms To move a different wavefor
437. output can be directed to a line printer or saved as a file Summary File Examples The following are examples of an individual summary file and a composite file printout Kalos 2 Summary File Example Printout Kalos Summary Tester ID ccastaldi Date September 17 1998 07 29AM Program lkg bl Device deviceName Flow flow Lot Alpha numeric Kalos 2 User Manual 143 4 Introduction to KITE Kalos 2 Integrated Test Environment Operator operatorName Comment comment Users C user message Tested 136 Passed 136 100 00 Failed 0 0 00 Categories Sorti K00 K02 Totals Percent 1P 30 21 56 41 18 2P 07 00 07 5 15 4P 26 00 26 19 12 6P 00 47 47 34 56 Softi K00 K02 Totals 11 35 21 56 12 07 00 07 14 26 00 26 16 00 47 47 End DataLog The DataLog control application supplies a basic interface for printout of the current datalog The Da Print button and for setting up options talog application is a viewer that displays the current datalogging results and histogram for DC parametrics Valuelog and judge tests a result from C Hook pass fail TPE Basic features of the application include The Da Kalos formatted text table and result text table with Kalos slice selections for individual and or composite datalogging viewing Datalog mode controls File management for ASCII text output file with either format talog property page provides a basic interface for getting the curr
438. overrides if necessary refer to DE Global Settings and Local Override Settings for DE DLLs For example the section for custom test dll which creates files with cst extension would be custom test ENABLED true Can be True False 1 0 FILENAME machine_id lotname flow_id _ time WAFER_FILENAME omachine idYo YolotnameYo flow_id wafer_num INT02 _ time FILE_EXTENSION cst Export Required Functions Functions exported by the DLL must be created These functions include DE DLL standard functions and functions registered for special events All exported functions must include the kdx_return macro instead of the return value This macro defines these as callback functions which return int type Usually a 1 is returned Create custom DLL API standard functions refer to Custom DLL API Standard Functions Create and register necessary for standard event functions refer to Standard Event Functions List all exported functions in the DEF file of the custom DLL project An example for registration of exported functions in CPP and DEF files follows the implementation of registered functions is not shown custom_test cpp kdx return kdx register callbacks void standard event functions if kdx add callback KDX START LOT start lot trig false return 0 if kdx add callback KDX START WAFER start wafer trig false return 0 return 1 Kalos 2 User Manual
439. own paaa a HEREG LANG PER A RR ERR E aai 25 Figure 20 Kalos2 Directory a e 27 Figure 21 KalosOS Directory cm book RA GA eee aa 28 Figure 22 Windows XP Start Menu and Explorer 29 Figure 23 Creating Shortcuts iis xe ER eR ERREUR RR 32 PLE MAI ELT 39 Figure 25 KTL Program ces usata dete o sei A Ron rl a ini Re RC pa 40 Figure 26 File Organization 2 0 0 0 6c eee ee nnne 43 Figure 27 Flow Levels c xa aaa dE ek BANK Re KAKA AG NANA 44 Figure 28 Socket Table maa e aci ele aoe ee AG Xe RPE SS 47 xii PN 071 0359 02 October 2005 Figure 29 Figure 30 Figure 31 Figure 32 Figure 33 Figure 34 Figure 35 Figure 36 Figure 37 Figure 38 Figure 39 Figure 40 Figure 41 Figure 42 Figure 43 Figure 44 Figure 45 Figure 46 Figure 47 Figure 48 Figure 49 Figure 50 Figure 51 Figure 52 Figure 53 Figure 54 Figure 55 Figure 56 Figure 57 Figure 58 Figure 59 Figure 60 Figure 61 Figure 62 Figure 63 Figure 64 Figure 65 Figure 66 Figure 67 Contents PINGIOUDe s su sce stake ee Pee AA 48 Pingroups and Socket Table Interrelationship 49 ber x exec ico pis Sun gee cece enla 50 Bin Table teens 52 Flow Statement llli 53 Kedit Online Help oocccccccocooooo 58 Kedit COM s Rack COR a GRAL CC ORC CIRCA 59 Program Load and Workspace a 60 Resource Icons ees 64 Toolbars ns 65 Pulldown Menu
440. own within the project c takes the user to the C source file which takes the user to the defining text within the kpl takes the user to the external KPL file that NOTE When clicking the right mouse button on a pattern or a CMODULE the standard Go To Definition Of pop up appears However when clicked followed by a pop up The is undefined appears indicates that the file does not exist within the KTL project Users can use the scroll bar on the right and bottom when navigating through the active window as well as use the Back To Reference Point arrow on the toolbar to successively go back to previous selections Kalos 2 User Manual 71 3 Test Program Definition Figure 40 Navigating in Kedit Ww class program ktl Afel E3 Wu PSET TAA PATTERN rdCKBDf alu pat FILE rdCKBDf alu START 0 TIMEOUT 0 0 FAILMODE SYNC a BE CYCLE TI PATTERN rdCKBDO alu pat FILE rdCKBDO alu START 0 TIMEOUT 0 0 FAILMODE SYNC D eri PATTERN wrtCKBD55 import pat FILE wrtCKBDS5 import START 0 TIMEOUT D 0 FAILMODE I Y PATTERN wrtCKBDAA import pat FILE wrtCKBDA import START 0 TIMEOUT 0 0 FAILMODE amp exp x PATTERN rdCKBD55 import pat FILE rdCKBDS55 import START 0 TIMEOUT 0 0 FAILMODE S f TIMING PATTERN rdCKBD import pat FILE rdCKBDAA import START 0 TIMEOUT 0 0 FAILMODE 3 ta AXIS PATTERN wrtaa subroutine pat FILE wrtaa subroutine START 9 TIMEOUT 0 0 FAILMODE
441. p is grayed out because it is a view only field Next enter the Axis Printout Start value Index value and Steps For this example set the Start value to 2 5 V set the Index value to 100 mV and set the number of Steps to 25 The VCC setup is shown in Figure 274 Kalos 2 User Manual 489 7 Shmoo and Bitmap Tools Figure 274 VCC Setup F Shmoo Application File Edit Utilities Tools Help a e 1 Test eso 7 Clear Index Steps 100mv 15 Trkt Pin Pin Group Symbol High Limit 25v Index Resource Stop 1 o VCCO MAIN 25v Y Step 7 Now that Setups are defined select the Selects property page which allows the user to define a the XY origin Top Left Bottom Left Top Right Bottom Right b the Type of shmoo 1D 2D 3D and c which pre defined variable Setup from Steps 5 and 6 to plot on the X and Y axis a For the XY origin click on the box labeled Bottom Left Corner b Under Types select the 2Dimensional Shmoo C In the Axis selects section set the Pass Skip number to 1 and choose TAA neg index for the X Select and VCC for the Y Select NOTE Pass Skip number controls the skip datapoints between the pass points For example if Pass Skip is set to 5 then the Shmoo
442. p values for the shmoo Adjusting these values changes the shmoo setups for all channels see Figure 291 Click the Pin Monitor tab Click the Pwr subtab of the Pin Monitor viewer Select a power supply on which to perform the test o NO Click the PS1M button to run the shmoo of the main resource only To test all resources one at a time click the Test button see Figure 296 NOTE Power supplies may not be tested in Grouped mode 516 PN 071 0359 02 October 2005 Pin Monitor Figure 296 Power Supply Shmoo Results o Shmoo Application File Edit Utilities Tools Help Action No Breaktrap currently set mua MEE ET DPS DP Symbol la VCCO DP10 VDD Shmoo Application Messages Kalos 2 User Manual 517 7 Shmoo and Bitmap Tools Value Log The Value Log application provides an AC Datalogger that is available on Kalos 2 test systems Two types of test execution are available to users a binary search or a linear sweep test Parametric PMU and or PPMU type of testing is not supported under this release The result is determined by the selected Setup and is the pass point at the detected fail pass region Define single test selected row or multiple testing all rows The start and stop test execution is determined by the pulldown Start Test menu on the Value Log property page see Figure 297 The Socket Table property page see Figure 298 allows the user to select G
443. page condition has no interactive control operations Online The Socket File Online property page shown in Figure 255 provides a viewer that displays the socket definition of the currently loaded program file The online Socket File property page shown in Figure 255 as with most property pages is divided into two areas The control area and the display area Note the displayed area is a read only interruption of the current socket file Kalos 2 User Manual 465 7 Shmoo and Bitmap Tools If you have clicked on the Get Online button to display the current property page the Socket File display is the text view of the current socket file The first three columns show the device information of DPin Device Symbols and the type of function of the Dpin Whereas the remaining columns show the Kalos 2 system definitions channel number DPS number ground the channel type and address decoder assignment NOTE The Socket File Get Online property page condition has no interactive control operations Figure 255 Socket File Property Page Online F Shmoo Application File Edit Utilities Tools Help wa S No Breaktrap currently set Socket rie SE Linkage Addresses Hee E ee ir SG GA Pin Definition Assignment Type DUT Dpins Device Symbols Normal Opt ECE Channel Normal Opt ECE T Do PABASA SS SES ADDRESS 1 ADDRESS IN EN RS SE Shmoo Application M
444. physical slice that is present FrontPanel Active Slices show only Front Panel enabled slices e Clear Selected Slice only the selected highlighted slice is cleared e Clear All Slices Window e Cascade standard XP display for manual data input MDI windows Tile standard XP display most commonly used List of available slice windows click to bring forward Options TPE Printf On enable all messages using TPE Print TPE Printf Off disable all messages using TPE Print 210 PN 071 0359 02 October 2005 CView Console Viewer Always On Top keep CView application on top of all others applications on desktop Utilities Launch the selected utility application Tools Launch the selected tool application Help e About CView standard help window Kalos 2 User Manual 211 5 KITE Utilities Test Debugger KITE s device debugger known as Test Debugger is an interactive utility that allows the user to modify settings such as levels timing and flow within a Kalos test program and immediately return to program execution of the selected slice without the need to recompile The Test Debugger is accessed from the Front Panel The Test Debugger utility is launched by clicking on the Test Bugger icon see Figure 135 or it can be selected launched from the Utilities TBUGGER menu item Figure 135 Test Bugger Icon Click here to open the Test Bugger utility System Front Panel File
445. point NOTE Single point testing is only available in normal 2 D shmoo Kalos 2 User Manual 457 7 Shmoo and Bitmap Tools Colors The Colors section of the interface identify datapoints that passed failed or were not tested by color All Pass green All Fail red Not Tested gray Graphic Area The graphic area displays the current shmoo 458 PN 071 0359 02 October 2005 Setting Up the Shmoo Plot Setting Up the Shmoo Plot The user has exceptional control over shmoo plot parameters Setting properties and conditions is accomplished by way of the shmoo graphical user interface The property pages are used to the setup these conditions Selects Property Page The shmoo plot Selects property page contains setup controls for XY origin shmoo plot type and defined variable setups for the X Y and Z axes The variable setups are defined under the Setups property page The Selects interface shown in Figure 252 is divided into functional areas based on these basic controls Figure 252 Selects Property Page 12 Shmoo Application O 1 Dimensional Shmoo X Only Normal Shmoo BINARY LOGBIN LINEAR LOGLIN E 2 Dimensional Shmoo X 8 Y Normal Pass Fail Shmoo PMU Plot DPS IMEAS Plot O 3 Dimensional Shmoo X Y amp Z Fail to Pass Sweep Poss to Fall Sweep ASCII Outputs O Standard PASS Non Tested Failed O Optional PASS Non Tested
446. r application Example 1 Setting up and Running a Test on T1 of an I O This example explains the procedure to run a shmoo on the T1 resource of an I O channel This procedure includes setting a breaktrap in Front Panel configuring Pin Monitor and setting up the shmoo parameters This example also covers the different testing options available on the Pin Monitor application Use the following procedure to run the Shmoo tool 1 Prepare the device and load the test program in the Front Panel 2 Select the flow type of the test program by choosing one of the options from the drop down menu list of the Flow options see Figure 283 Note that this option requires two or more available test flows Kalos 2 User Manual 503 7 Shmoo and Bitmap Tools Figure 283 Select Flow tJ System Front Panel File View Options Utilities Tools Help Haa ws Y I Ha Les wl v Action Fi Soft Keys FKA FK2 FK3 Active Slices Bank a aaa a YU UY YU Ei Hi Device IF t 06 2003 01 52PM Devic deviceHame Serial Ho 0000000 27 Lot Alpha numeric Flow Operator operatorHame Teste A11 rest flow DIB part DIE Erase flow Comment comment a Users C user message Write AAAA Flow Bend ABAA Flow Sort Results gt REN BOUE 5 shert Configuration _ Hate tata 2 e All test Elow gt gt 64 sites 48chns 22sites 96chns 165ites 192chns Ssites 284chns Azites 768chns CESS
447. r 2005 KALOS 2 HARDWARE CONFIGURATION This chapter provides an introduction to the Kalos 2 tester architecture and system functionality An overview describes the testers its features functions and configuration The major units discussed include e Test Head e Server Host PC Main Board IMPORTANT Version Compatibility Recompile Test Programs Per the Kalos software release policy all test programs must be recompiled when upgrading to a major release i e 2 3 x to 2 5 In order to use the 2 5 version of software all test programs must be compiled with the 2 5 compiler An error message will be issued at load time if the program was not compiled with the 2 5 compiler When upgrading a minor release i e 2 3 1 to 2 3 2 or patching an existing release i e 2 3 1 to 2 3 1 1 test programs do not require recompiling Kalos 2 User Manual 1 1 Kalos 2 Hardware Configuration Introduction The Kalos 2 test system is a general purpose test system with the additional features necessary to optimally test non volatile memories embedded non volatile memories and high volume logic As shown in Figure 1 its small size and highly integrated design optimizes test floor space and lowers the cost of testing Use of common I O pins and resources per pin allow testing and programming of logic pattern device tests and standard device under test DUT interfaces Tester per DUT architecture allows each device test to proceed i
448. r and one axis value Two axis values To specify a waveform segment 1 Click the Segment calculator button 2 Using the two columns define the segment that is to be the new waveform 3 Click OK The new waveform appears in the TOS position The original waveform remains unchanged and next to TOS Using the DSP Function Menus The rectangular area in the lower left corner of the Analog Wavetool is sometimes collectively referred to as the calculator area The DSP functions menu section comprises 11 buttons as shown in Figure 155 that make up the right half of this area The other buttons are the display buttons Figure 155 DSP Functions wf Trans gt Filter we Arith P Statistic windows wiArith p wrMeas gt Invoit gt wf Math gt Pulse gt User gt The gt symbol on these buttons indicates that each has a pop up menu To see the menu click the button The following sections describe menu options for each button All operations and measurements with the exception of the Segment function are performed across the entire waveform on a data point by data point basis For binary operations such as add or multiply the sample interval is ignored and the data points of the two waveforms are combined based upon the selected operation The resultant waveform has the same sample interval and number of points as the TOS waveform before the operation Kalos 2 User Manual 257 5 KITE Utilities
449. r band pass and band stop filters can be misleading if the bandwidth limit is not set for these filter types Pulse Functions This pop up menu offers several sets of functions that can be measured In all cases except settling time quadratic interpolation is used to increase the accuracy of the measurements To select the pulse for all but settling time 1 Place one cursor before the first edge of the pulse 2 Place another cursor after the last edge of the pulse The region between the cursors is used for the pulse measurements If this region contains two edges between the cursors the Period Pulse Width function returns just the pulse width If three or more edges are in the region the period and duty factor based on the first three edges are returned To select the pulse for settling time 1 Place the first cursor at the location from which the settling time is to be measured 2 Place the second cursor in a region of the pulse that is settled usually near the end of the pulse No interpolation is done by the settling time function Pulse menu items and a description of each function are shown in Table 22 Kalos 2 User Manual 269 5 KITE Utilities Table 22 Pulse Function Descriptions Amplitude Rising Edge Falling Edge Period Pulse Width Rising Falling Overshoot Settling Time Serial to Parallel Parallel to Serial Menu Item Function All T
450. r char of the string specified in the Find what edit box is not replaceable with corresponding vector char of the string specified in the Replace with edit box then a warning message appears about the impossible replacement see Figure 198 Figure 198 Find Warning Messages LDTool A H can t be replaced with O position 3 Kalos 2 User Manual 335 5 KITE Utilities Find And Replace Column Dialog This modeless dialog allows the user to search and find a string of vector characters along the columns of the LDTool window and replace it with another string see Figure 199 Figure 199 Find And Replace Column Dialog Find And Replace Column Find what HHL Replace with Jun Find only in the selected column s Replace Replace All The search and replacement go on down if Down is selected or up if Up is selected along the columns of the LDTool window starting from the first selected column If no column is selected then it starts from the first column User can check the Find only in the selected column s check box to cover only the selected column s Go to Dialog This modeless dialog allows the user to jump to the desired Address Vector ID or Fails see Figure 200 336 PN 071 0359 02 October 2005 Logic Debug Tool Figure 200 Go To Dialog If Address is selected in the Go to Enter Address 3 314 what list then you can specify the E 2 desired address in the Enter EET Ad
451. r conditions are met 84 PN 071 0359 02 October 2005 Figure 51 Arm And Trigger Conditions E History Ram Control Number of cycles before and after arm 8 5 Storage Mode Other Settings Before Arm amp Trig STV v Arm First Instruction 7 Trigger on Fail trigger After Arm amp Trig Trigger First Instruction Am Condition Trigger Condition 8 EE Arm and z Trigger Loop Courter IA Condition Loop Counters AN fields mere ml T QST RR Resource L combo box UG RIN TI E a a A a AG e pee n a Aa T V reist Jb OR Edit box NA Save Settings Get Settings NIAN Kedit The Before Arm 8 Trig edit box allows users to specify how many cycles to retrieve prior to the arm and trigger event The After Arm amp Trig edit box allows users to specify N that is the number of cycles to be stored in the History RAM once the arm and trigger conditions are met A valid number is from O to 63 The sum of cycles before and after arm 8 trigger cannot exceed 64 The Arm Condition and Trigger Condition fields contain arm trigger conditions A definition of each condition box shown in Figure 51 follows e Cycles Set number of cycles before and after trigger conditions are met Storage Mode Specify storage condition i e store all store this vector store only fails store this vector and store fail only e Other Settings Arm and trigger instructions Resource combo box Contains
452. r it can be selected launched from the Tools menu item Figure 313 BitPower Icon Click here to open the BitPower tool Help J l O Aa S Alle Kalos 2 User Manual 539 7 Shmoo and Bitmap Tools This page intentionally left blank 540 PN 071 0359 02 October 2005 A GLOSSARY OF TERMS This glossary defines terms particular to Credence test systems as well as terms specific to ATE applications These terms appear throughout all Credence high performance tester manuals Numerics active load active test site ADC APG API argument ASIC autorange A programmable circuit that acts as a pullup or pulldown load when connected to a DUT pin An operational test site that has tester channel numbers present in the pinlists of the test program A multisite device test starts with all operational sites active as determined by a prober or handler device interface If a device fails its site is deactivated that is its channel numbers pins are removed from the pinlists At the end of the test all sites are activated again Analog to digital converter Algorithmic pattern generator Application programming interface A collection of functions or classes that are written in C or C or another programming language A value or address passed to a function at the time of call also referred to as actual parameter Application specific integrated circuit The change of the
453. r of cycles Group Delay This operation takes the two TOS waveforms and calculates the group delay and frequency response waveforms The TOS waveform is assumed to be the output of the DUT while the next to TOS waveform is assumed to be the input waveform to the DUT Both input output waveforms must contain a single edge not a pulse The user is prompted for the following parameters Bandwidth limit enter 0 0 for no limit Filter type Low Pass High Pass Band Pass or Band Stop When this function is performed the group delay waveform is pushed onto the stack followed by the frequency response waveform The following results are written in the transcript pane Frequency response In addition the following markers are added to the waveforms Low Pass Filter Frequency Response in Hz the 3dB point of the frequency response waveform Group Delay peak to peak maximum and minimum of group delay waveform before the 3dB point High Pass Filter Frequency Response in Hz the point 3dB down from the last data point in the frequency response waveform 268 PN 071 0359 02 October 2005 Waveform AWT Table 21 Wf Meas Function Descriptions Cont Menu Item Function Group Delay Continued Band Pass Filter Center Frequency maximum of the frequency response waveform Band Stop Filter Center Frequency minimum of the frequency response waveform Note The center frequency fo
454. ral formats including user defined formats DE receives all necessary information from Kalos 2 datalog Datalog can be enabled by the TPEDatalogOn function or by the buttons on the DataLog tab of Front Panel The use of TPE functions is strongly recommended refer to Switch Datalog Files Generation On Off Datalog enabling from Front Panel also enables datalog displaying which significantly increases testing time Data Engine Connection to Kalos Datalog Stream Datalog server client architecture in Kalos 2 software version 1 9 and before provides a mechanism for capturing test datalog in binary format by several applications Datalog server client is composed of two main components Dlogserver application and a client application The Dlogserver application captures all test datalog and sends it to the client application in binary format The client application formats the binary test datalog sent from the Dlogserver The client applications communicate with the Dlogserver through dlogclient dll The Data Engine connects to datalog as a client application for Dlogserver This is illustrated in Figure 215 Kalos 2 User Manual 373 5 KITE Utilities Figure 215 Datalog Architecture in Kalos 2 Software Versions 1 9 and Before Other clients Dlog Engine Connection to Kalos Datalog Stream The Dlogserver is not a separate application in Kalos 2 software Dlogserver functionality is included in the Dlog Engine which connects
455. rce Fly By Tool TipS a 62 Table 6 Kedit Menu Bar Description 000 0c eee eee 68 Table 7 Front Panel Menu Bar Description 111 Table 8 Sine Waveforms llis 230 Table 9 Ramp Waveforms a 230 Table 10 Triangle Waveforms 00000 cece eee eee 230 Table 11 Sawtooth Waveforms 0 0000 cece eee ees 231 Table 12 Pulse Waveforms llle 232 Table 13 Gaussian Noise Waveforms a 232 Table 14 DC Waveforms llis tees 233 Table 15 Result Markers llli llle 252 Table 16 WC Arith Function Descriptions oooo o o oo 258 Table 17 Wf Arith Function Descriptions oooooooo o o 259 Table 18 Wf Math Function Descriptions llle sess 259 Table 19 Wf Trans Function Descriptions lille 262 Table 20 Statistic Function Descriptions 205 263 Table 21 Wf Meas Function Descriptions 24 264 Table 22 Pulse Function Descriptions llle 270 Table 23 Filter Function Descriptions a 275 Table 24 Windows Function Descriptions llle 277 Table 25 Int Diff Function Descriptions llle sess 278 Table 26 Commands recognized by AWT user command Interpreter 286 PN 071 0359 02 October 2005 Contents Table 27 Conventional symbols in LATool waveform area 311
456. rd is changed NOTE e Password character lengths are determined by the system administrator A warning message is displayed if the password is not long enough Upon your next login remember that you have changed your password Upon logging into the system the user desktop display shows the resources that are accessible These resources are set up by the system administrator NOTE The system does not display password characters on screen This is for security purposes Once logged in the Windows XP desktop appears see Figure 18 Kalos 2 User Manual 23 2 User Operations Figure 18 Windows XP Desktop 24 PN 071 0359 02 October 2005 Logging Off and Shutdown Logging Off and Shutdown When you have completed work on the computer you should log off the system Log off of the system by pressing CTRL ALT DELETE keys to get the Windows XP Security window or by selecting Log off or Shut down from the Start menu See Figure 19 Log off is used to log off your account without turning off the workstations power Shut down is used to power down the workstation Figure 19 Log Off and Shut Down NH Internet i Netscape Navigator Eb Kalos a Configuration Manager E mail Netscape Messenger la Eb Kalos Configuration A WordPad zl Calculator ES Files and Settings Tr Wizard Microsoft Visual Sour 6 0 Y Paint All Programs Accessories t Applications Developer te Games B I
457. re Arm amp Trig edit box allows the user to specify the number of cycles to be passed before arm and trigger event The After Arm amp Trig edit box allows the user to specify the number of cycles to be passed after arm and trigger event This number can be at most 63 The sum of these two numbers can be at most 64 Storage Mode The STV Store This Vector and SOF Store Only Fail checkboxes allow selection of STV or SOF mode Other Settings Arm First Instruction if checked LDTool starts data storing in History RAM at the first instruction of the pattern Trigger First Instruction if checked LDTool passes after the first instruction as many cycles as specified in the After Arm amp Trig edit box and then stops storing Trigger ON FAIL if checked LDTool passes after the first occurred fail as many cycles as specified in the After Arm amp Trig edit box and then stops storing The Arm Condition and Trigger Condition fields contain arm trigger conditions Definition of each condition is presented by the following boxes Resource Box Contains the name of the resource to be conditioned Check Box Check uncheck for enable disable the defined condition Edit Box Allows users to specify the value of the selected resource to be Matched during the test for generating arm trigger event Users can save the current settings by clicking the Save Settings button and then restore them by clicking the Get Settings button The Re
458. re load in the selected ETX slice The difference is the Apply operation also sends the resource table to the Kalos 2 hardware When selecting the Set operation unless the debug modes of looping are being executed the user must restart the device program to initiate changes NorE The Apply Set buttons are active only if their backgrounds are highlighted yellow The PMU test of the current test can be displayed and its setup viewed and or edited The selected PMU conditions are displayed by entering the test string or by way of the pulldown selection All or any conditions can be changed 444 PN 071 0359 02 October 2005 Property Page Functions Figure 243 DPS PMU Property Page PMU Setups Tab ES Test Debugger Application File Utilities Tools Help dg Program ifh demo Flow Shmoo Vlog PinMon DEMO Test Debugger Messages NUM 11 16 00AM A Setups Setups are Shmoo and Valuelog setup tables and expression sequence editors see Figure 244 This allows for modification of setup values by editing the respective text field white area only A toggle button in the upper left corner of the page allows the user to select Shmoo or VLog If shmoo is selected the user can select a shmoo table from the Shmoo Table drop down menu If VLog is selected the user can select a value log table from the VLog Table drop down menu Kalos 2 User Manual 445 6 Test Debugger Figure 244 Setups Property Pa
459. reo mes res mes ree j Text Sums All Summary Summary Slices Bank B Summary Slices Bank C m2 DD ANN Tester ID kneves dxp Date April 18 2003 12 48PM Program AK2 multiDut4 Device deviceName Flow standard Lot Alpha numeric Operator operatorName 40 100 00 Failed A01 Totals Percent 00 20 20 20 A01 Totals 00 20 20 20 FrontPanel Messages 4 Ready NUM 12 48 21 PM Text Summaries The summary text table is a composite All summary with the totals added automatically for the selected slices A summary text table is displayed in Figure 86 item 3 Kalos 2 User Manual 133 4 Introduction to KITE Kalos 2 Integrated Test Environment Summary Graphics The summary provides multiple views of current summaries of active Kalos 2 slices Two types of views are available under this property page They are bar graphs and pie charts The selection of which view is displayed is determined by clicking the Bar Graphs or Pie Charts selection next to the TYPE button Individual Kalos 2 summaries can be viewed by clicking on the applicable summary slice subtab Selecting the A the default subtab displays a composite summary of all enabled slices NOTE Switching between display views does not destroy data Summary Bar Graphs Clicking the Bar Graphs button displays a bar graphic view of the composite All summary
460. rior to executing a test flow Once the user has selected the desired Kalos 2 slice to Breaktrap on one of the following available Breaktrap settings can be chosen Pause Step BreakMeas BreakTestSeq BreakFail LoopTest LoopMeas When the Pause Step Breaktrap is set the user can step through each command line in a test When BreakMeas is set on a selected test measurement the program executes all tests in the flow up to and including the selected test then waits for the user to click on the Start or Stop button or launch Kalos 2 application debugging tools such as Shmoo Test Debugger and ShowBitz BreakTestSeq operates the same as BreakMeas however this setting allows the entire sequence to run BreakFail can be used to detect the first failing tests in the test flow However after the first failing test is detected you can manually step through the test flow After the failing test is displayed in the Action field users can launch the ShowBitz utility to modify the current settings that is voltage levels timing etc LoopTest Breaktrap is useful when examining signals on the oscilloscope While looping on a test the user can launch the Test Debugger application to modify DPS Levels and Timings value on the fly LoopMeas Breaktrap is useful when examining signals on the oscilloscope While looping on a measurement the user can launch the Test Debugger application to modify DPS Levels and Timings val
461. rk a printer must be set up for the system Refer to the Windows XP online help if instructions for printer setup are needed Backup Summary Final Sends the summary to a printer also saves the summary to a backup file and clears all summaries Partial Same as Final except it does not clear summaries DUT Sampling If enabled automatically saves to a backup file Kalos 2 User Manual 131 4 Introduction to KITE Kalos 2 Integrated Test Environment Print Prints the last summary that was transferred to a backup file Clear Erases any information currently displayed in the window FBins Functional bins FBins visible highlighted if Get FBins button is enabled Get FBins Gets current FBins from enabled Kalos 2 slices if all slices are in Ready state 2 Summary Slices tabs Graphical tabs that when clicked select the Kalos 2 slice for individual viewing The All tab combines all available slices 3 Draw area User selected functional page Displays selection of summary text or graphic 4 Status bar Displays the status of the application including real time clock 132 PN 071 0359 02 October 2005 KITE Software Figure 86 Primary Window Layout system Front Panel E 0f 34 File View Options Utilities Tools Help 4 ta Ss Y BE 9 Has lt ene e wl eea a eredenee Action Fit Soft Keys ra mo mo res me me rc me reo rao re
462. rly For this purpose VC icon must be added to the Kalos Configuration Manager In the Kalos Configuration Manager select Option Customize menu and then select Add Application Use the browser window to go to C Program Files Microsoft Visual Studio Common MSDev98 Bin A file called msdev exe appears Select the msdev exe file and press OK A new icon for VC appears in the Kalos Configuration Manager This step is required only once 384 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine Create Project The project for DLL must be created using MFC AppWizard dll template project Run VC from Kalos Configuration Manager Select File New from the VC menu and then Projects tab from opened dialog Select MFC AppWizard dll template from the list Enter the name for the custom DLL in Project name box and check project path in the Location box e Click the OK button Select the Regular DLL using shared MFC DLL radio button Press the Finish button then the OK button Include Header Files Kalos 2 and DE header file kdx if h must be included to get type and function declarations Include the files at the main CPP project file just after the automatically created include statements Setup Header Files Directory The directory of the included header files must be set in the project s settings These files are put in the KALOS HOME Vnclude directory at DE installation Here
463. rm AWT Compare Edge Start Window Compare Stop Window Compare Compare Edge Marker The compare edge marker uses the label field to show the type of edge compare high low or tristate The marker is located at the marker X coordinate The Y coordinate shows the comparator threshold In the case of a tristate compare an additional data item of type double is for the marker The label for this data item is high and the data is the comparators high threshold level If the marker label is low a vertical line is drawn from the top of the patch to the compare threshold Y coordinate If the marker label is high a vertical line is drawn from the bottom of the patch to the comparator threshold If the marker label is tristate a vertical line is drawn from the top of the patch to the high compare threshold Y coordinate and a vertical line is drawn from the bottom of the patch to the low compare threshold data item labeled high The compare lines are drawn in the same color as the waveform Start Window Compare Marker The start window compare and stop window compare markers define a window comparison It is assumed that a start window compare precedes each stop window compare although other markers can be defined between the two The X coordinate shows the start time of the window compare the Y value shows the comparator threshold The label is used to specify the type of comparison low high or tristate The start window compare
464. roduction to KITE Kalos 2 Integrated Test Environment History RAM Control The history RAM is a 64 location deep memory that is capable of storing nearly the entire state of the Omni including both the Pattern Generator PG subsystem URAM address loop counters and logical address and data and Timing Generator TG subsystem comparator expect and actual data at set condition cycles The primary function of the history RAM is to improve datalogging This means More complete datalog information is available Improved programmability when selecting windows and cycles e Relevant values are contained for DUT time rather than terminal values at the end of the burst The history RAM Control allows users to monitor conditions of the pattern and timing generator at a set condition point within a functional test or a point within a patterns execution The History Ram Control is launched by clicking on the KDatalog icon see Figure 101 on the Front Panel or it can be launched selected from the Datalog property page If selected from the Datalog property page ensure that Datalog On is highlighted then select the Func modes option followed by the Detail option as shown in Figure 102 Figure 101 History Ram Control From Front Panel KDatalog Icon Click here KDatalog icon to launch the History Ram Control a 40 O HP SxS un v m xu tale 158 PN 071 0359 02 October 2005 History RAM Control
465. rom the context menu Figure 58 Pin Options Menu Context level 0 addr 0x20019cd0 func c debugger example file chook debugger c line 42 Flow chook pat debug flow gt Name Value user Inputi Ox2200b640 23 endchar Ox2200b642 hour 15 min 1 gt sec gji An Show all Pi un DP29 DP28 DP27 MORS DP25 DP24 DP23 DP22 1 TI 12 T3 T4 m T2 13 14 11 T2 T3 T4 iss 4 n 7 713 t4 11 72 T3 T4 m 12 13 T4 11 12 13 14 L L x x L L x x L L x x x L L x x L L x x L L x x L L x X H L L Selected Pit gt i L L x x L L x x L L x x a X L L x x L L x x L L x L L x x L L L L x x L L x X H LiL x x L L x X H L L x X H LiL x x L L x x L L x x L L L L x x L L x x x L L x x x x L L x L L x x L L H L L x H Li L x H L L x Pins displayed in the TG window list pins from the least significant bit LSB I O 0 on the left side to the most significant bit MSB I O on the right side of the window The data are further broken down to show all four timing edges for each of the pins listed The following is a list of entries for each timing edge and their meanings see Figure 59 X Represents the data is Don t Care or that there was no programmed data for this pin edge L Indicates pass data if shown in the color green Therefore the format was an expect data low which is the TG data H Indicates pass data if shown in the color green Therefore the format
466. rom the loaded ktl program and the loaded DLL Device IF Breaktrap Settings Breaktrap setting operations are available under the Engineering property page Breaktrap settings are conditions set by the user to configure the Kalos 2 system to specific requirements prior to executing a test flow Once the user has selected the desired Kalos 2 module to Breaktrap on one of the following available Breaktrap settings can be chosen Pause Step When the Pause Step Breaktrap is set the user can step through each action item in a test Kalos 2 User Manual 153 4 Introduction to KITE Kalos 2 Integrated Test Environment BreakMeas BreakTestSeq BreakFail LoopTest LoopMeas When BreakMeas is set on a selected test measurement the program executes all tests in the flow up to and including the selected test then waits for the user to click on the Start or Stop button or launch Kalos 2 application debugging tools such as Shmoo Test Debugger and ShowBitz Allows the entire selected test sequence to execute This is used with the cell current measure feature of the Bitmap tool which allows the user to run a setup pattern BreakFail can be used to detect the first failing test in the test flow However after the first failing test is detected you can manually step through the test flow After the failing test is displayed in the yellow action field users can launch the ShowBitz utility to modify the current setting
467. ronment is available Calibration of the system is intended to always be backward compatible to previous operation system revisions dibcal cal The dibcal cal program is invoked by selecting C Kalos bin dibcal cal from the File gt Open menu or from the Open Flow tool bar button in the Calibration Diagnostics window see Figure 118 The dibcal cal calibrates to the open socket of the load board This calibration program must be run anytime the Kalos 2 tester is initialized that is other calibration programs were run loss of communications Map INIT load board probe card change Front Panel load etc This calibration adjusts tester timing for the specific device load board and thus requires that the board is present NorE This program is the same as DIB CAL on Front Panel Refer to the DIB Info tab selection kcal cal The standard calibration program is kcal cal It is located in the same directory as dibcal cal The program appears as a window within the Calibration Diagnostics window Both calibration and diagnostics programs are controlled in the same matter The kcal cal calibrates out to the pogo pin Calibration is run as a periodic Kalos 2 User Manual 185 4 Introduction to KITE Kalos 2 Integrated Test Environment maintenance whenever a board is changed a power system change occurs and with any major change such as repair of the tester Periodic maintenance calibration is run every 90 days 186 PN 071
468. room to be directly above the cursors In this case each cursor box shuffles around to be as near as possible to its cursor without any cursor boxes being hidden If there is not room to display all of the cursor boxes the boxes furthest to the right do not display Each cursor box contains a label a Y value and an X value Label The first item in the box the name of the cursor Y Value The Y value at the current cursor location Changing this value changes the data point X Value The X value at the current cursor location Changing this value moves the cursor Creating a Cursor To create a cursor 1 Right click in the patch that contains the waveform to which you want to attach a new cursor 2 From the pop up menu choose Create New Cursor as shown in Figure 145 Figure 145 Cursor Menu Create New Cursor Create Trigger Marker Fitto Window Edit Composite Waveform Decompose Packets Convert to Rrect 3 Enter the name of the new cursor as shown in Figure 146 234 PN 071 0359 02 October 2005 Waveform AWT Figure 146 New Cursor cursor name Cursor Box 4 Click OK Modifying a Cursor To modify a cursor 1 Right click on the label of the cursor box or near the vertical cross hair of the cursor to display a pop up menu list as shown in Figure 147 Figure 147 Cursor Menu Change Name Change Color Remove Cursor Set as Left Delta Cursor Set
469. roperty page 423 428 434 sequence 424 setups 424 445 socket 423 test 424 timings 424 window 422 test editor 435 test elements 435 test execution binary search 451 452 518 linear sweep 451 452 518 test fixture components 97 test fixtures 97 test head cooling 11 description 5 layout 6 opening mechanism 8 power shutoff switch 10 test overview 435 test program components 419 current 131 file organization 42 loading 200 test program file 41 test program language 37 test programs 104 Test property page 434 overview 435 test elements 438 test specification 551 Test break test 424 tester 551 hardware 108 introduction 1 set up 4 tester resources pin types 45 testing devices 95 TG 551 Thevenin load 551 time set marker 250 564 PN 071 0359 02 October 2005 time out 551 timing data EdgeSet 441 timing set 551 timings property page 442 waveforms 443 title bar 30 title marker 249 TO 551 toolbar test debugger 427 tools debugger 419 tools editing 64 tore This Vector and Store Fail Only 84 TPE 551 trace 551 Transcript Pane 283 triangle waveforms 230 Trigger Condition 85 tristate 552 TSET 552 TTarget 101 Types condition shmoo 460 types of markers 248 undo level 227 uRAM 552 user account 22 ID 22 interface 20 26 28 operations 19 password 23 User Functions 278 user interface 220 user units mode 223 Value Log 451 App
470. rovide real time compression not the highest compression rate Text Dump File Events such as DLLs loading unloading test results file creation and warning messages are displayed in the field at the bottom section of the settings dialog All messages can also be written to the DE text log file The file collection can be enabled and adjusted using KDX LOG DUMP and DUMP DIR fields in kalos production ini refer to DE Global Settings Postprocessor Dump File The default postprocessor def move bat uses another log file refer to Postprocessor Errors are logged by default for all processed files to the KALOS HOME Mestidata engineldef move log file The file name and logging process can be adjusted by modifying the postprocessor script Offline Mode DE in offline mode does not connect to Kalos 2 datalog and it uses the datalog binary file as input Offline mode recreates the runtime environment using the data in the binary file Selection of Online Offline modes is performed by the OFFLINE key in the DATA ENGINE section of the kalos production ini If this key is true the binary file open dialog appears at DE startup The datalog binary file TestBin101 bin is supplied for customer support purposes Figure 213 Binary File Selection in Offline Mode A 2x Look in Stee Mee Ee js aaPVM MSG NORM READ MSG bin desti la aaTestBin bin NewBins laa LargeDump bin OldBins laa MedDump bin stdf2ascii la aaNormRea
471. rs the samples of the TOS waveform thus changing the number of repetitive cycles displayed and making the details of each cycle more or less visible Kalos 2 User Manual 261 5 KITE Utilities Table 18 Wf Math Function Descriptions Cont Menu Item Function Split Splits a CRECT or Polar waveform into two RRECT waveforms POLAR Splice Splices two RRECT waveforms into a single Polar waveform CRECT Splice Splices two RRECT waveforms into a single CRECT waveform wf Trans Functions Wf Trans functions are used in Waveform transformations between time domain and frequency domain convolution and correlation Wf Trans menu items and a description of each function are shown in Table 19 Table 19 Wf Trans Function Descriptions Menu Item Function FFT Takes the FFT of the TOS waveform IFFT Takes the Inverse FFT of the TOS waveform Note The waveform must be of type CRECT Linear Convolve trout i Linear Convolve Performs a linear convolution of the TOS with the Circular Convolve next to TOS waveform Correlate Circular Convolve Performs a circular convolution of the TOS with Modulate the next to TOS waveform Correlate Correlates the TOS with next to TOS Modulate Takes the TOS waveform as a carrier and the next to TOS waveform as a modulator and pushes the result of modulating the carrier by the modulator onto the stack Both wav
472. rshoot Copy Paste Write to File Clear NOTE The size of the transcript pane varies depending on the physical size of the Waveform tool To delete results from the transcript pane 1 Select the text to be deleted 2 Right click in the transcript pane and choose the Cut menu item To copy results from the transcript pane to another editor 1 Select the text to be copied 2 Right click in the transcript pane and choose the Copy menu item 3 Open a text editor or other word processor and select the menu item Edit Paste To copy text into the transcript pane 1 In the source editor select the text you wish to copy and choose Edit Copy 2 In the transcript pane right click and choose the Paste menu item To write the results of the transcript pane to a text file 1 Right click in the transcript pane and choose the Write to File menu item 2 Inthe dialog browse to the desired directory and choose a filename 3 Click the Save button To delete all text in the transcript pane Right click in the transcript pane and choose the Clear menu item 284 PN 071 0359 02 October 2005 Waveform AWT Entering a Shell Command To enter a shell command 1 Click the menu item Tools gt Shell This is the same as choosing the Calculator menu item User gt Shell See Figure 163 Enter a shell command 3 Click OK Figure 163 Shell Command Dialog Box Scope Mode Optio
473. rst index now equals the last index and the last index equals the first index Another way to do this is to rotate the waveform around the Y axis Wf Math Functions Wf Math menu items and a description of each function are shown in Table 18 Table 18 Wf Math Function Descriptions Menu Item Function Polar Performs a Polar conversion of a CRECT waveform that is converts Sine and Cosine vector components of a CRECT waveform into MAGnitude and PHASE POLAR Rectang Performs a Rectangular CRECT conversion of a POLAR waveform that is converts the MAGnitude and PHASE components of the POLAR to Sine and Cosine vector components Log Takes the log any base of the TOS waveform Kalos 2 User Manual 259 5 KITE Utilities Table 18 Wf Math Function Descriptions Cont Log R Power base wf Power wf exp Sqrt Histogram Average Interleave Deinterleave Encode Decode Mux Demux Reorder Split POLAR Splice CRECT Splice Menu Item Function Power base wf Takes the BASE of the TOS waveform Base defaults to 10 Note that this is the inverse of the log function Power wf exp Raises the TOS waveform to a power Sqrt Takes the Square Root of the TOS waveform Histogram Creates a histogram of the TOS waveform The waveform must be scaled such that its minimum is greater than or equal
474. ructure curar te e De SR SCR RC dee Pun 355 Figure 210 DE menu with Data Engine icon 004 356 Figure 211 Settings dialog Kies PEKE ERRARE i eee 357 Figure 212 About dialog oues sek es Rhone RR RR hn RR n 358 Figure 213 Binary File Selection in Offline Mode 360 Figure 214 Dlog Engine Icon Enabled Disabled States 362 Figure 215 Datalog Architecture in Kalos 2 Software v 1 9 and Before 374 Figure 216 Datalog Architecture in Kalos 2 Software v 1 10 and Later 374 Figure 217 Structure of custom DLL 0 384 Figure 218 Cal Diag logon esee ko RR RR ERR E KAI RR ERR 410 Figure 219 ShowBilz ICDrT i waa na daa eth a a ice ra A 411 Figure 220 ShowBitz Interface Window 00 e ee eee eee 412 Figure 22 SIDROM CON saa cetovnise Seabee ewe ne Sera dora band 415 Figure 222 System Monitor 2 22 2 ce eee ee ee eee ee ee eae es 417 Figure 223 MAP INIT iiu xxn ER ERRARE TERRE es ond CR RR KAR KANG 418 Kalos 2 User Manual xvii Figure 224 Figure 225 Figure 226 Figure 227 Figure 228 Figure 229 Figure 230 Figure 231 Figure 232 Figure 233 Figure 234 Figure 235 Figure 236 Figure 237 Figure 238 Figure 239 Figure 240 Figure 241 Figure 242 Figure 243 Figure 244 Figure 245 Figure 246 Figure 247 Figure 248 Figure 249 Figure 250 Figure 251 Figure 252 Figure 253 Figure 254 Figure 255 Figure 256 Figure 2
475. ry by clicking on the name to select it then type in the name change and click on the Rename button Kalos 2 User Manual 99 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 65 Configuration Manager Options Customize 100 PN 071 0359 02 October 2005 Target Manager Target Manager The Target Manager application is used to view the status of all boards in the test head The Target Manager TTarget is responsible for establishing connection with the target CPUs in the test head This is also the first application to enable interactive control of the test head from the host PC After TTarget is started its icon see Figure 67 appears in the task bar notification area also know as the System Tray found at the far right of the task bar When the mouse hovers over this icon the message Double click TTarget icon to show Target Manager Viewer appears Right mouse clicking on this icon displays the pop up window shown in Figure 68 Doubling clicking on the TTarget icon in the System Tray or clicking the right mouse button and selecting Show Targetmgr viewer displays the Target Status window shown in Figure 66 Target Status The Target Status window see Figure 66 displays the 72 possible targets or Kalos 2 slices These are further broken down into groups A B C and D representing 18 slices each Graphical images show the status of each slice Figure 66 Target Status Window eR Targ
476. s 10 43 58 AM 4 DIB Info The DIB application see Figure 80 interacts directly with the Device Interface Board DIB Non Volatile Memory NVM devices It can perform the following tasks e Search and broadcast DIB NVM data to all the Kalos 2 boards e Allow interactive modification of the NVM contents if the NVM uses the recommended NVM format Format a NVM device e Load the NVM from a file Kalos 2 User Manual 121 4 Introduction to KITE Kalos 2 Integrated Test Environment e Save the NVM contents to a file e Protect Unprotect NVM data from change factory use only The follow are read only view options available from the Front Panel DIB Info property page Show a map of which slots are attached to NVM devices Show the contents of any DIB NVM slots if the NVM uses the recommended NVM format DIB Info is the readback calibration status of each Kalos 2 slice It has no relationship to the NVMDIB the two are independent of each other NVMDIB is the readback of the current device interface board IDROMs if the user has implemented them Detailed information on the NVMDIB utility is provided in the NVM User s Guide located under the Help menu of the NVMDIB utility DIB slices Kalos 2 sites where a DIB CAL will be performed DIB CAL ALL Performs DIB CAL on all available sites DIB CAL Status current active status of DIB CAL for the specified site s Kalos Slices Condition gt statu
477. s Levels levels gt Pn00 VIH 4 000 V VIL 0 000 V VIHH 5 200 V VOH 2 000 v VOL 1 500 Y VTH 1 750 Cursor Time 98 857 nS Voltage Measure 3 H Time Drag the range nS 0 0nS 10 0ns 20 0nS 30 0nS 40 0nS 50 0nS 60 0nS 70 0nS 80 0nS 90 0nS Voltage Drag the range V H H H H H D H LDTool WaveForm LATool DSTool Datalog Ready M A 96x4 ONLINE patLym96x4 V2 Setup Group Select or type the desired channel number in the Channel combo box and the cycle number in the Cycle edit box If the LATool window is opened you can right click the cycle of the channel you are interested in and choose the Scope This command from its context menu In this case LDTool turns to the DSTool window with the corresponding numbers for the channel and cycle already set 314 PN 071 0359 02 October 2005 Logic Debug Tool Define the following values for VOH and TIME Start Values of VOH and TIME from which the measurement should start idee Increment of VOH and TIME between two sequential measurements Stop VOH and TIME at which the measurement should stop Numbers of measurements to be done beginning from Start Steps values up to the Stop values Click the Default button to set the following default values for the selected channel the start value of VOH equal to VIL the stop value of VOH equal to highest of VIH or VIHH the start time equal to 0 the stop time
478. s caldiag960 et C Debug Macros amp 3 ow Release O include Gr C3 kmos CJ targetmgr a 3 ket Crest 3 Macros Dtestcases E Release ETTarget Gr E vshadow targetmgr B Test a Data O DevicelF S 1 testcases E TTarget C3 Kalosos C LDClient lisa e My Music Ommi Data C3 ONYX PROM FILES 5 C3 Program Files Sysprep XP E temp E Tornado AE B E users WINDOWS wuremp GQ xilinx El Sb CD RW Drive D E 2 pmadison on Fremont YCS Cluster cafsrv1 i SP anne nn Fremant WOS Cluster raFervt From Y lt C KalosOS Directory The Kalos OS subdirectory contains the vxworks files which direct the TTarget to load the correct version of software This directory structure is shown in Figure 21 Software Architecture Type Date Modified File Folder 2 18 2003 4 41 PM File Folder 2 18 2003 4 43 PM File Folder 2 18 2003 4 42 PM File Folder 3 4 2003 10 17 AM File Folder 11 26 2002 2 21 PM File Folder 11 26 2002 2 20 PM File Folder 11 26 2002 2 17 PM File Folder 11 26 2002 2 17 PM File Folder 1 28 2003 9 24 AM File Folder 12 23 2002 3 25 PM File Folder 2 18 2003 4 43 PM File Folder 11 26 2002 2 17 PM File Folder 11 26 2002 2 21 PM File Folder 11 26 2002 2 21 PM File Folder 11 26 2002 2 17 PM 1KB TextDocument 2 18 2003 4 41 PM Kalos 2 User Manual 27 2 User Operations Figure 21 KalosOS Directory DER a File Edit View Favorites Tools Help
479. s such as voltage levels LoopTest Breaktrap is useful when examining signals on the oscilloscope While looping on a test the user can launch the Test Debugger application to modify DPS Levels and Timings value on the fly LoopMeas Breaktrap is useful when examining signals on the oscilloscope While looping on a measurement the user can launch the Test Debugger application to modify DPS Levels and Timings values on the fly NOTE You can only debug one module at a time Choose the module by clicking on the module you wish to debug under Debug Module in the Breaktrap Settings area on this property page Implementation Following is the definition of the Breaktrap Settings as defined by the Kalos 2 Test System Test Measurement FAIL The execution of each item in its SEQUENCE 1 A measurement taken on one of the power supplies or the parametric measurement unit MEAS VCCO I VCC1 I VPPO I VPP1 I PMU Or 2 The execution of a pattern burst PG RUN Fail of a measurement Note There could be more than one measurement in a test SEQUENCE 154 PN 071 0359 02 October 2005 KITE Software Step Sequentially execute every action item resource statement C function etc in its SEQUENCE upon pressing the Start button To enable the Step Breaktrap Setting the Pause button must first be selected Once BreakMeas is set on a selected test measurement the program executes all tests in the flow up to an
480. s 2 main board and the other is for the DUT connector The circuits that control fan speeds set of three fans that control the cage temperature are also located here Main Clock Each backplane contains a 400 MHz crystal as the main clock This clock is the original clock source for each set of nine Kalos 2 96 pin memory boards connected to each backplane board Kalos 2 User Manual 7 1 Kalos 2 Hardware Configuration Backplane IDROM A non volatile memory NVM chip is located on the backplane that contains the electronic information of the backplane such as part number ECO level etc Figure 5 Backplane Board ls 000 28 IBM TU E i E eooldidildita i tfft e o A i coore t tT A 3g 87 nin SE O oO 6 ut ego doo i 000 eoe TTT oo o Interlock 11000 ooo BENENESERENENERE poco 000 35V EINE Ethernet 4 Le 445V Future 445V M DUT un Control Test Head Opening Mechanism The test head opening mechanism is pneumatically driven using 80 psi of compressed air This provides access to one side of the test head Compressed air is ported to provide the pressure necessary for the pneumatically driven motor to open the test head when the Power Lock Switch is pressed 8 PN 071 0359 02 October 2005 Kalos 2 Test Head To close the test head pull down th
481. s VPP high voltage supplies PMUTEST The PMUTEST statement is used to set up measurements for the system parametric measurement unit PMU The system PMU supports a full range of operation LEVELS The LEVELS statement defines the voltages to be used for driving input data comparing output data and performing current loading Levels on the Kalos 2 system are per pin Each pin has three driver levels VIL VIH and VIHH two output compare levels VOL and VOH and two current loads IOL and IOH which are triggered by the DUT output crossing the threshold voltage VTH VTH is a reference voltage set somewhere between VOH and VOL that determines when to source or 54 PN 071 0359 02 October 2005 Test Program File sink current to or from the DUT If the DUT output goes above VTH the IOH current load turns on and sinks current from the DUT If the DUT output goes below VTH the IOL current load turns on and sources current to the DUT EDGESET The EDGESET statement contains the timing tset format fset and period information used to completely define the waveforms for each pin of each cycle AXIS The AXIS statement specifies the parameters used in generating Value Log VLOG data and Shmoo plots SHMOO The SHMOO statement specifies the parameters for generating a Shmoo plot A Shmoo plot graphs the PASS FAIL result of testing a device while changing one or more of the test parameters VLOG The VLOG statement allows
482. s are treated as one group This result is visible only if the selected channel remains the same after the test is run Kalos 2 User Manual 513 7 Shmoo and Bitmap Tools Figure 293 Grouped Testing 2 Shmoo Application File Edit Utilities Tools Help Sas Test stop zem Je d EE EN Pin Monitor vamos og Action No Breaktrap currently set Pin Monitor Maa evels Socket File Shmoo Application Messages 04 36 19 PM 4 Example 2 Characterization of Power Supplies This example shows how to setup and run shmoo testing of a power supply using the Pin Monitor application Using Pin Monitor to initiate shmoo testing of a power supply is very similar to that of a channel The following steps are used to setup and run the shmoo testing using Pin Monitor Seta breaktrap as shown in Example 1 Initiate the Pin Monitor application 1 2 3 Click the Power Setups tab 4 Select a DPSSET either by clicking the Break Test button see Figure 294 or by manually selecting the DPSSET used by the test on which the breaktrap is set see Figure 295 514 PN 071 0359 02 October 2005 Pin Monitor Figure 294 Setting DPSSET Using the Break Test Button Shmoo Application File Edit Utilities Tools Help a e Kalos 2 User Manual 515 7 Shmoo and Bitmap Tools Figure 295 Manually Selecting a DPSSET 5 Adjust the Index and Ste
483. s circuit board module socket table In the Kalos Test Language KTL a data structure that contains pin maps and pin resource definitions source current active load Conventional current flow out of a DUT with the active load as pulldown source voltage active load Terminal voltage at a DUT acting as current source spooler A process that queues jobs for background printing or other tasks SRAM Static random access memory EMU memory for data generation and error capture 550 PN 071 0359 02 October 2005 strobe switch ASIC Tg terabit test specification tester TG Thevenin load time out timing set TPE trace A signal that clocks a logic state into a latch or D flip flop In a semiconductor test an edge strobe records a comparison result at a specified instant in the cycle a window strobe records any error occurring during a timed interval Another custom CMOS chip on Kalos 2 The switch ASIC serves several purposes First it provides for electrical disconnect of the Pin Electronics and the PMU from the DUT Second it provides the Vihh drive circuitry and finally it provides the Thevenin resistive load There are six channels per Switch ASIC Time zero the instance used as the reference for the timed events of a device test during one clock cycle Ten to the twelfth 1012 bits A document defining the operational parameters of a device An assembly of apparatus used for evaluating semi
484. s conditions Maplnit nothing performed yet CAL Pass passed dibcal green CAL Fail failed dibcal Read NVM Read IDROM on load board or probe card NVM DIB Identification identifies all load board IDROM information 122 PN 071 0359 02 October 2005 KITE Software Figure 80 DIB Info Li System Front Panel File View Options Utilities Tools Help Gal go 29 a O IStart amp Stop Action Mod FR Soft Keys FK1 ro rms ra rs re rc re re rao rei reo res reas res Fr i fo aa a AO me DIB Info DIB Slices Bank A DIB Slices Bank B DIB Slices Bank C DIB Slices Bank D gummi ETT 1 TT a III CT 7 TTTTTTTTTT lang DIB CAL Kalos Module Condition gt NYM DIB Kalos Module Part Number Register U2 Register U3 Register U4 FrontPanel Messages Ready NUM 03 57 01 PM NOTE Anytime the DIB Info property page is selected the call for readback is automatically executed It is not possible to edit the NVMDIB loadboard identification from this page Device IF The Device Interface Device IF property page shown in Figure 81 contains information for any peripheral probing or handling device Direct Test or manual mode is the default mode of the tester In manual mode the test start command is sent directly to active sl
485. s primary use is to ensure that the application is initialized with predefined conditions The Display Socket File button updates the display by row column and IO selections to the socket table NOTE If the Display by socket file is compatible a socket table is generated in the display however it has no relationship to the socket table Figure 306 Display Socket amp Setups Definitions Property Page Online Socket Display Socket File File Bitmap Application Sa e 2a Re ae el Detinilons Display Socket amp Setups Socket Table Filler only Generated by Display by Rows Columns amp IOs Definitions NOTE The Display Socket File property page condition has no interactive control operations 530 PN 071 0359 02 October 2005 Bitmap Online The Online Socket File shown in Figure 307 provides a viewer that displays the socket definition of the currently loaded program file This section of the property page is divided into three areas display area socket table and scan setup area Notice the Socket Table area is a read only display of the current socket file The socket table display area is the text view of the current socket definition The first four columns show the device information DUT DPin IO Scram and Device Symbols and the type of function of the Dpin The remaining columns show the Kalos 2 s
486. s string const char kdx get device finis representation for device finish Time Date Kalos DUT site number used in the following functions is calculated by the formula Kalos DUT site module DUTs per module DUT site on this module where modules range from 0 to number boards in system 1 and DUT sites range from 0 to number DUTs per board 1 394 PN 071 0359 02 October 2005 Return Value kdx get current site kdx get device num kdx get site info of site to which current datalog data refers Returns device sequence number in wafer for last device or for current device on specified site Returns total number of tested devices in wafer Returns total number of passed devices in wafer Returns device sequence number in lot for last device or for current device on specified site Returns total number of tested devices in lot Returns total number of passed devices in lot Gets total number of active sites and puts their Kalos DUT site numbers into array Datalog Engine and DLOG Engine Description of Return Value Parameters Kalos DUI site int number Device sequence int number in wafer Kalos DUI site number or 1 for last device Total number of tested devices in oo int site 1 int void MN of passed devices in wafer A Device sequence int QE Kalos DUI site number or 1 for last device int Total number of
487. s text only It is positioned at the marker X coordinate with other cycle related text The Y coordinate is not used The label contains the scan partition and link for the current cycle Any given cycle has either a vector or scan never both Elapsed Time Marker The elapsed time marker prints text only It is positioned at the marker X coordinate with other cycle related text The Y coordinate contains the elapsed time value This is done so that the Waveform tool can format the data appropriately using engineering notation and add the X units from the waveform data structure The text displayed consists of the marker label followed by the formatted elapsed time value and the appropriate units Cycle Set Marker The cycle set marker prints text only It is positioned at the marker X coordinate with other cycle related text The Y coordinate contains the cycle set used for the current cycle This information is also contained in the label so the Waveform tool does not use the Y coordinate Time Set Marker The time set marker prints only text It is positioned at the marker X coordinate with other cycle related text The Y coordinate contains the time set used for the current cycle This information is also contained in the label so the Waveform tool does not use the Y coordinate Compare Marker The Analog Wavetool groups the following three marker types together under the label Compare 250 PN 071 0359 02 October 2005 Wavefo
488. s that print in the transcript pane are also printed as comments in the log file mark results on off Enable or disable the creation of markers for the results of measurements When on results of simple measurements mean std minmax pulse measurements etc have markers of type Results added to the appropriate location in the waveform mean std Find the mean and standard deviation of the top of stack waveform median Find the median of the top of stack waveform minmax Find the minimum and maximum data points in the top start double stop double waveform on the stack If start and stop values are provided only the region between these values is checked If no values are provided the entire waveform is checked mult Multiply the top two waveforms on the stack mult const double Multiply the top waveform on the stack by a constant norm Normalize the top waveform on the stack max 1 0 min 0 0 polar Convert the complex rectangular waveform on the top of the stack into a polar waveform polar splice Convert the top two real rectangular waveforms on the stack into a single polar waveform pop Pop the top waveform off the stack The waveform is lost power base double Raise base to the power of the data value in the TOS waveform Note that the calculator button for this command is label
489. s the type of components in this entry The value may be RELOC and or FIXED If this entry is not currently in the SRAM the status is filled with dashes Ji This field reports the SRAM assigned to the fixed and or reloc components in this entry The value may be MEM A MEM B or BOTH where BOTH indicates the two memory fields are combined into one BOTH occur only in the single slice configuration of 48 channels The two slice configuration of 96 channels always has SRAMs MEM A and MEM B Depending upon the organization of DUT data in the SRAM rows partial SRAM rows may result Row start represents the first bit of the first row of this entry at which to start Zero 0 indicates starting at the first bit in the row Depending upon the organization of DUT data in the SRAM rows partial SRAM rows may result Row end represents the last bit of the last row of this entry to which it ends Zero 0 indicates ending at the last bit in the row This field is the test program resource name that defined this entry 156 PN 071 0359 02 October 2005 KITE Software Figure 100 DBM SRAM Viewer EST GI Panel E File View Options Utilities Tools Help DBM Slices Bank A DRAM DRAM SRAM fixed offset reloc offset fixed offset SRAM Row filename hex fixed size reloc size reloc offset STATUS SRAM Start Resource FrontPanel Messages Ready NUM 02 04 47 PM Kalos 2 User Manual 157 4 Int
490. s the user to choose only among those vector characters with which the vector character selected in the Find what combo box can be replaced Click Find Next to find the next occurrence of the value vector character specified in the Find what box combo box and then stop Click Replace to replace the found occurrence with the value vector character specified in the Replace with box combo box and then stop Click Replace All to replace automatically all occurrences of the search criteria in the LDTool window In this case a message appears and shows the total number of the occurred replacements Find And Replace String Dialog This modeless dialog allows the user to search and find a string of vector characters along the lines of the LDTool window and replace it with another string See Figure 197 334 PN 071 0359 02 October 2005 Logic Debug Tool Figure 197 Find And Replace String Dialog Find And Replace String Find what HLL Replace with LHH Down C Up Replace Replace All The search and replacement go on forward if Down is selected or backward if Up is selected along the lines of the LDTool window starting from the selected line If no line is selected then it starts from the first line The user specified strings in the Find what and the Replace with edit boxes should be of the same length Otherwise a warning message will appear about the unequal lengths of the specified strings If any vecto
491. s to include in check Return Thirty two bit unsigned sum of the bytes representing the DUT data Kalos 2 User Manual 353 5 KITE Utilities Datalog Engine and DLOG Engine Data Engine and Dlog Engine are highly customizable datalog utilities for Kalos2 series testers Both utilities generate several standard and user defined file formats for device testing results Both Data Engine and Dlog Engine are referred to as DE in this chapter If either program is specified directly that reference applies to a specified program only Differences Between Data Engine and Dlog Engine Data Engine and Dlog Engine are the same application intended to work with different versions of Kalos 2 Software refer to Kalos 2 External Datalogging Overview Data Engine for Kalos 2 Software version 1 9 and before Dlog Engine for Kalos 2 Software version 1 10 and after The difference is the way the applications are connected to Kalos 2 datalog from which they receive data Data Engine uses Dlogserver for connection Dlog Engine connects directly Dlog Engine includes all functions of Data Engine Dlogserver STDF ini file parsing refer to Use of Runtime Decode Strings and STDF ini and other functions that require modifications in Dlogserver Although DLLs Dynamic Link Library for both applications have the exact same functions they are NOT interchangeable DE Structure DE receives all necessary data from the Kalos 2 datalog
492. s to monitor watch or edit global resources from within the C source file or variables that are declared external variables which are passed into the C source file from other C source files This is accomplished by clicking on the selected variables and dragging them into the watch window 80 PN 071 0359 02 October 2005 Kedit Figure 48 Variables Selection gt BURRO cen aay Passed in external variable _ Context window Variables window Flow selection mp ae Current C function Watch window Local variables The variables window displays local variables variables declared within a C function Within the variables window users can select the flow to debug using the flow selection This is performed first or before executing code during the debug session The variables window is a view only window To edit these local variables users must drag the selected variables into the watch window The context window displays where you are in the debug session NOTE As C code executes variables that have changed appear in red Variables declared with the static keyword will always have a value of 0 The value of static variables is hidden from the debugger The watch and variables windows are used to track the values of the variables used within the loaded C source file Any currently loaded pattern can be debugged using the KPL debugger From C source files use th
493. scare 533 Search Tables Fail User Property Page 534 Overview amp BIM Viewer 2G 535 BIEPOWOF a KAKA RR EORR ea Raa a wm KAL KARLA eal RO A aw KANG 539 Appendix A Glossary of Terms icono ER ETRAS 541 MAEN A b DNA DI KAR BABA ES BE Jd Rd AR ee RARUS xau EE d RE 555 List of Figures Figure 1 Kalos 2 Test System 0 0 cee es 3 Figure 2 Tester Set Up Xa maa zu ER RR ERO RR UKRAINE RA KR RC ACAD 4 Figure 3 Test Head Layout 4a mada NEA rase arb E Ra RR NG 6 Figure 4 Pin Configuration Breakdown llle 7 Figure 5 Backplane Board ia usd b RR nr xx Rude d 8 Figure 6 Control Air Schematic 0050 ee 9 Figure 7 Test Head Opening Mechanism lilius 10 Figure 8 Power Shutoff Switch ooooooooooooommnmmos 11 Figure 9 Tester Cooling System ee 12 Figure 10 Interface Unit and Pin Layout 0 000002 eae 13 Figure 11 EMO and Test Head On Off Controls 14 Figure 12 AC Control BOK aga ma dh nac wh a Han ele i Ra ka NG 15 Figure 13 Most Computer ii edes eR nhe ROS e d mob Re pra ence 16 Figure 14 Hardware Configuration llle 17 Figure 15 ETX Module ea xs RR Re ree 18 Figure 16 Logging ON usua arp e RE RR rm ne Ed aou dw d Rd 22 Figure 17 Logon Information 000 e eee eee 22 Figure 18 Windows XP Desktop lt o lt oeoooooooocorarnnas 24 Figure 19 Log Off and Shut D
494. ser to load GPIB drivers DLL s and perform an automatic dibcal if enabled before a program load To access this property page select Operator IF from the File menu of Front Panel Loading of the datalog server can be selected radio button selection by way of the Operator IF property page There is also an option that loads and calculates the checksum for a selectable DBM file The Operator IF validates the checksum by verifying it against another input or checksum The GPIB and hex file options are configurable within the project files The user can also specify header information for the System Front Panel application Once the Operator IF is launched it locks the Front Panel property pages until the user either loads or cancels the Operator IF operation by clicking on the applicable button Load Cancel at the bottom of the property page 120 PN 071 0359 02 October 2005 KITE Software NOTE Device IF yield monitor and selectable options on the Operator IF feature are setup in the KPJ file Figure 79 Operator IF Property Page E System Front Panel File View Options Utilities Tools Help ta SEE Sz O boe s JAE EO wl v EXE O EA C YusersipmadisoniVss checkout in aemo 3 ss src directory src directory not Found src patimame tte 16 hex file SUM Linecheck e 32 Note Operator Interface locks out All FrontPanel Operations Either Load or Cancel to reset Normal Operation
495. set button resets the settings as shown in Figure 194 Kalos 2 User Manual 331 5 KITE Utilities Figure 194 Set Get Reset Buttons Arm And Trigger Conditions Cycles Storage Mode Other Settings Before rm amp Trig v STY Arm First Instruction V Trigger on Fail o After Arm amp Trig 63 v SOF Trigger First Instruction Arm Condition Trigger Condition Loop Counter 0 ce Loop Counter 0 Loop Counter 1 e Loop Counter 1 Loop Counter 2 Loop Counter 2 Loop Counters uRam Address Loop Counter3 uRam Address m a a a Repeat Counter Cycle Counter Cycle Counter Refresh Counter YM Address LVM Address Match Counter Match Caunter LY Cycle Counter LYM Cycle Counter Address M ce Address M Address IN Data M r r r F r r r r r r r r F PM S r S E B E ES B EE E E poem E y em mum Ec o E pamumuna E uus Data N Save Settings Get Settings Find Dialog This modeless dialog allows the user to find a value or vector character in the LDTool window See Figure 195 332 PN 071 0359 02 October 2005 Logic Debug Tool Figure 195 Find Dialog Select Columns TSet Find what Channels Find what Repeat fi 2 C Current z STY C NCD o C SYNC C Selected C IGNF In case of searching a value user should select the desired column by clicking one of the TSet Repeat S
496. setting up the tester resources DPS stimulating the device sending patterns to the DUT and verifying the results measuring parametric values or verifying patterns from the DUT A test statement defines a point in a flow which consists of an entry point and two exit points one for pass and one for fail Each test has an associated pass fail counter which is initialized to a O whenever a test is created Each time the test is executed one of the pass fail counters increments to reflect the test result These counters are used to track part of the statistical data that is provided in summaries Tests should be completely self contained Any step required to perform a measurement or other action should be included in the sequence This allows for movement within the flow or deletions without effecting other tests This also facilitates the development of test libraries which help to reduce program development time Kalos 2 User Manual 49 3 Test Program Definition Each test statement may contain a test name and number a description of up to 1023 characters and a sequence The test number can be any positive integer The test name cannot be repeated but the test number can Depending on the nature of a test its sequence may contain data to be applied to the tester known as resources actions such as taking a measurement and or references to the user code known as a C Hook When the test is executed each item in the sequence e
497. splayed Figure 106 Setting Trigger Conditions E History Ram Control Storage Mode Other Settings iv STY Iv Arm First Instruction Trigger on Fail Cycles Before Arm amp Trig o After Arm amp Trig IE Arm Condition Trigger Condition T fo rj occ A DEBER DONE QU NS ft a aan GS maa hil lio Ci reses Counter PN Rare dl PA Ma Le Deuter ie IMM mui comin Refresh Counter Mo JRefreshCounter T D RS MA rod MR AAA Ua gem hU A A o aa Save Settings Save the current settings Set before and after counters here Y SOF Trigger First Instruction The trigger condition shown here is the default setting Get Settings Restore the previous settings Kalos 2 User Manual 167 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 107 Apply Reset Save Get Settings EN P ouem p LN Data N I BE Save Settings Get Settings Save and Get Settings Apply and Reset buttons KDatalog History RAM control setting successfully OK prompt for applied settings NOTE The user can only apply the history RAM to the currently loaded pattern 168 PN 071 0359 02 October 2005 Breaktrap Settings Breaktrap Settings Breaktrap setting operations are available under the Engineering property page window only Breaktrap settings are conditions set by the user to configure the Kalos 2 system to specific requirements p
498. ss False Fail device pin Destination buffer for number of channels connected to pin Destination array of connected channels numbers Size of Destination buffer for pin name string Destination buffer for pin type string Destination buffer for pin assignment string Destination buffer for pin alt type string Destination buffer for char assign exp pin alt assignment string Kalos 2 User Manual 391 5 KITE Utilities General InformationD Return Value Description of Function Name Description Return Value Parameters Parameters const char Test program name kdx get program na Gets test program string char b f s NULL Destination buffer for test program name Gets device name char buf NULL Destination buffer for device name const char ow ID string Gets flow ID char buf NULL Destination buffer for flow ID COTO string Gets lot ID char buf NULL a buffer for Operator 1D string kdx_get_operator_id Gets operator ID char buf NULL Destination buffer for operator ID Gets user text from eset Text stig ee Front Panel char buf NULL estination buffer for user text const char User comment string kdx get user comm Gets user comment ent from Front Panel char buf NULL Destination buffer for user comment Machine ID string kdx get machine id Gets machine ID char buf NULL Destination buffer for machine ID Geis tester ID which kdx_get_tester
499. st more than one device either in parallel or in sequence The sequential test of two or more devices is called a ping pong test Multiplexer A memory device type that does not require a power source to maintain its data contents Kalos 2 User Manual 547 A Glossary of Terms O Omni A highly integrated 18 u CMOS chip comprising timing formatting pattern sequencing and algorithmic pattern generation for 48 I O channels and 2 utility channels operational test Test sites on a multisite test head declared on to the test sites program This assures that a test site is usable no broken Socket channel runs exist An operator can declare test sites non operational P PAC Pin analog controller parallel test Testing more than one device simultaneously using a single test program and a test head with more than one test site parameter A quantity in a function or subroutine or at a device port the value of which is selected according to circumstances Parameters are distinguished from variables recorded measurements and constants fixed values A formal parameter is one defined within a function parameter file A data set containing the voltage current and timing information for a specified test on a particular device parametric test The measurement and verification of terminal voltage and current characteristics at a device pin PASM Pattern assembler loader pattern The binary data applied to and expected from
500. t Sums In Figure 83 only Kalos slices A00 and A01 which are the Total Sort Optional Multi DUT individual summaries and the Soft binning results The device counts and the their respective percentages are displayed with or under defined labels If a prober dll is loaded then two summary types are made available to the user a standard text summary and the optional text wafermap Printouts are available for both summaries standard text summary file smy and the wafermap file wmp FBin is an optional function that is available for displaying KTL FBins if they are in the currently loaded program Figure 83 illustrates the summary showing the current active Kalos 2 slices A00 and A01 If an individual Kalos 2 slice summary is desired click the respective summary slice tab for the results of that slice NOTE Switching between views does not destroy summary data The system type Kalos 2 64 site 48 channel is displayed at the top next to the Start Stop control buttons The second header All Summary shown in Figure 83 is determined by the selection of the tab All or A00 through D17 Banks A B C and D s 0 17 on the System Front Panel Summary Property page Figure 83 shows the Tab All selected which comprises all the enabled Kalos 2 slices In this case A00 and A01 are the only enabled slices If A00 or A01 are selected then the All Summary changes to Kalos Summary Summary Graphics The
501. t between 0 and 63 A non zero value of N allows N more cycles to be stored including the trigger event itself while a zero prevents any storing When the store this vector mode is enabled only cycles which have the URAM bit STV set store data into the History Ram When the store on fail mode is enabled only the cycles that have a strobe fail store data When both the store this vector and store on fail modes are enabled both the STV URAM bit and the strobe fail must be true for storage Storage Stored system resources include Uram Address Counter Subroutine Stack Address Repeat Counter Loop Counters 0 1 2 3 Match Counter Cycle Counter Refresh Counter Logic Address M N Logic Data M N LVM Address LVM Cycle Counter Arm Occurred Trigger Occurred Stored channel resources include either high low comp glitch or high low expect data is stored depending on the selection at db se tg comp EXp data TG A B C D high comp glitch or high comp expect data TG A B C D low comp glitch or low comp expect data TG A B C D high comp data TG A B C D low comp data TG A B C D fail TG A B C D strobe on this edge Kalos 2 User Manual 161 4 Introduction to KITE Kalos 2 Integrated Test Environment Arm When arm first instruction is selected arm occurs on the first cycle otherwise arm occurs when all enabled arm conditions are true The following resources can be used to set the condition or conditions for arm Tri Uram A
502. t menu and launch Windows Explorer Next select the desired file or application and click on the right mouse button A pulldown menu appears see Figure 23 Choose Create Shortcut In the directory where the file or application is located a Shortcut file is created Kalos 2 User Manual 31 2 User Operations Figure 23 Creating Shortcuts 5 Release Q Address Folders E Back amp ps d orites arch ie Folders EE Release v Eso x e Apps C O Actuate amp C3 BACKUP amp O Clarify amp DELL amp E DISCOVER amp Documents and Settings pos amp C3 DRIVERS E Kalos bin E doc amp O gnu amp include lib E src amp C3 Test Userdata E O Kalos2 CD Macros Release D AE FMapping ak 8 C samples Al Using Shortcuts 1l E gpibfunc lib T E HelpIndex txt Fhex2zkdb exe lt ibmTest exe E ibmTest ilk E ibmTest pdb J idrom exe E ih_cd960 0ut epih_dtsCal cal fas ih_dtsData dia fa ih kcal cal ag ih kchk48 dia fa ih kchk96 dia aig ih kchk dia f kcal cal 3 kcc bat da kchk dia KControls dil si KControls lib FE KDatalog exe dikedit exe E Kedit kwd kadbis86 exe kload exe Scan for Viruses t Add to Zip t Add to Kedit zip Send To Cut Copy Create Shortcut Delete Renam
503. t string gt Write the waveform on the top of the stack to the indicated file in ASCII AWAV format ADIF format is no longer supported for writing waveforms write awg Write the waveform on the top of the stack in AWG format The file name is derived from the waveform name write parallel swav lt string gt number bits int scale lt double gt offset double interleave factor int code format int Write the waveform on the top of the stack to the indicated file in parallel SWAV format based on the given parameters write serial swav lt string gt number bits int scale double offset double Isb msb first code format int Write the waveform on the top of the stack to the indicated file in serial SWAV format based on the given parameters zoom int display y up down Go to the next higher up or lower down scale factor for the Y axis of the indicated waveform zoom cursor lt string gt string Zoom the X axis between the two named cursors All waveforms with the same units as the waveform s included by the indicated cursors are zoomed zoom display x up down Go to the next higher up or lower down scale factor for the X axis All waveforms with units the same as the TOS waveform are rescaled zoom previous lt string gt Restore the previous X and Y scale and position va
504. t the chosen history RAm position a green arrow inside the pattern source code Uram Address Uram address number This number displays the Uram address for the associated history RAM location Arm Arm state If checked indicates the arm is set for this location of the history RAM Trigger Trigger state If checked indicates the trigger is set for this location of the history RAM Fail Pass Fail A red F indicates a fail An empty box indicates a pass NOTE Saved data appears in the history RAM as soon as the pattern is armed and triggered Double click on any line in the datalog dialog window to see the corresponding line in the source file of the pattern A green arrow shown in Figure 55 indicates that line in the source file A trigger icon a T within the symbol indicates the line where the first arm and trigger occurred 88 PN 071 0359 02 October 2005 Kedit Figure 55 Source File Location cen COLA 2450 ub Ol Trigger icon Green arrow indicates the pattern code location after a history RAM location is highlighted below Content iei Daw THAI Stel Jure t debugger ami fes oho debugges C ee AT i Te pwn rn s n nu ziziz zixiz z sziziziz sz z s PG section TG section PG information displayed for the Addr M N windows is the data presented to the address generator s As shown in Figure 56 counter group format can be displayed in decimal or h
505. ta by channels Figure 182 or by pins Figure 183 Figure 182 Data by Channels 318 PN 071 0359 02 October 2005 Logic Debug Tool Figure 183 Data by Device Pins Right click the top part of the TG field to open its context menu Figure 184 Figure 184 TG Field Context Menu ll Xuum AU E v Show all Pins Xi XiH n ix DX Ola NE Show IO Pins MUR DE De m Hide all Pins d Hem TE crue Lo X X X Selected Pins v XTAL1 IL X x i v RESET 1 X ia Show Channels a hak Ba ix X X Show Device Pins KE L X X ES v XTAL2 pepse i X iX v Show Pin Names LikX X bMS V ALE I BRI nd racial 1 PIE ep a EN pure SE Users can Show all Pins Show IO Pins only or Hide all Pins Point to the Selected Pins Figure 185 and select the desired pins from the pop up menu to display the columns of their states The selected pins are marked with check marks Select Show Channels to view the states by channels or select Show Device Pins to view them by pins Select also Show Pin Names to view the corresponding names Two modes are available for showing the states of channels pins Brief and Detail In Brief mode the cells of the TG field show only Pass P and Fail F states see Figure 185 Kalos 2 User Manual 319 5 KITE Utilities Figure 185 Brief Mode TG ng d d d img iii wiwi ew E i ma ex TA AT Mex P P mimi ii iii ing
506. tart 1 500uA Index 0 200uA Steps 50 Stop 1 000uA Y Axis VariableName Start 5 500 V Index 0 100 V Steps 20 Stop 4 500 V 5 500 V 5 000 V 484 PN 071 0359 02 October 2005 Shmoo Plot Example Shmoo Plot Example The following are the specifications for the shmoo plot example used in this section Device used 28F016SV 16 MBIT 1 MBIT x16 FlashFile MEMORY X axis variables PINGROUP DBUS Pins DQO DQ15 NorE In KTL Kalos Test Language a PINGROUP can contain one or several pins After a pingroup is defined it can be used as a shorthand approach shortcut for referring to several related pins Y axis variables VCC 1 Parameter tested tacc tavav time t from address A valid V to the outputs Q becoming valid V Datasheet specification tayoy max 70ns Implementation 1 The following example is the method used to Breaktrap on the read AAAA fast pattern 2 Figure 272 illustrates the timing diagram of the read cycle in the read AAAA fast pattern Kalos 2 User Manual 485 7 Shmoo and Bitmap Tools Figure 272 Read Cycle of read AAAA fast Period is Set to 200 ns CECONTROL TI 5 ns T2 90 ns OECONTROL T1 10 ns T2 90 ns WECONTROL TI S ns T2 95 ns TI 80 ns T2 85 ns DBUS Tl 5 ns T2 90 ns ADDRESS The timing format and period for the cycle shown in Figure 272 are defined in the section of the KTL program quoted i
507. tches on the datalogging in the start and endtest section of the EVENT MAP Kalos 2 User Manual 379 5 KITE Utilities NOTE For additional information on TPEJudgeResults and TPESetTestName use refer to the TPE API Reference chapter of the KITE Reference Manual part number 071 0455 xx Also refer to the View C Hook Results in the Histogram Application Note for detailed information on TPEJudgeResults Assigning a Unique Test Number to Each Test and Bin Using the same test numbers for different tests is not restricted by KTL syntax Test numbers and test names are also optional Using the same hard or soft bin numbers is not restricted although the current structure of Datalog and DE does NOT support this flexibility and refers to the tests and bins by their numbers Using the same test number for different tests can however cause unpredictable results in generated files Using the same hard and soft bin number for different bins can cause bin names in generated files such as Hard 1 or Soft 1 instead of real names Therefore it is up to users to ensure that the different tests in the test flow have unique different test numbers DE can also create consecutive test numbers automatically For example there is a test in the KTL with test number 1000 In the test sequence of this test a C Hook is called which executes 10 PMU measurements inside a loop This means the STDF file contains 10 PTR parametric test records records 1000
508. tely Remove Track Cursor Returns the track cursor to its native state Grabbing and Moving a Cursor To grab and move a cursor 1 Place the mouse pointer on or very near the cross hairs within ten pixels or about an eighth of an inch until the pointer turns into a four headed arrow The pointer must be in the same patch as the cursor Click and drag the cursor to its new destination Once you have grabbed a cursor its cross hairs extend horizontally and vertically to the edge of the waveform graphic pane NOTE If you move the mouse left or right the cursor tracks the waveform to which it was originally attached If you move the cursor up or down it attaches itself to the waveform above or below on the stack Kalos 2 User Manual 237 5 KITE Utilities If a cursor is not displayed in the waveform area grab the cursor by clicking the label of the cursor box If the cursor is attached to a waveform that is not displayed it remains in the original waveform until the cursor is moved into the waveform graphic pane At that time it jumps from waveform to waveform as the mouse pointer moves from waveform to waveform Moving a Cursor by Moving its Cursor Box To move a cursor by changing its X or Y values 1 Inacursor s box click in either the X value or the Y value field 2 Change the value in the field then press the Enter key The waveform is modified to have that value at the current cursor location and the
509. tement is shown in the example below Any information enclosed in brackets is optional TEST name TESTNO number DESC string SEQUENCE iteml item2 itemN The following actions are available for use in the test sequence Refer to the Kalos Test Language chapter of the K TE Reference manual for a definition of each test sequence ADC control CRAM CLR ALL loc CRAM LOG desc text loc CRAM LOG msg loc DELAY time ECR CLR ECR CLR PG1 PG2 ALL ECR CLR PG1 PG2 DUTwidth Xsize Ysize FORCE PMU voltage IF CRAM loc operator expr2 true sequence false sequence IF expr1 operator expr2 true sequence false sequence IF FLAG amp elope2 XT XF INC FBIN functional bin LOOP count sequence MEAS unit ON fkey sequence PAUSE 436 PN 071 0359 02 October 2005 Property Page Functions PG RUN pattern pc ALL PINS PG RUN PRECOND PG STOP PMUCONN pin dps OPEN PMU RUN PMU SET BUMP V voltage SET pin dps state SET var name value SET variable expression SET ALT pin alternate state SET BlN target bin source bin SET flag SYNC CYCLE name SYNC PC pc Kalos 2 User Manual 437 6 Test Debugger Figure 236 Test Property Page Test Elements Reedy NuM DAM 7 Sequence The Sequence property page displays the details of any sequence s in a test for which the brea
510. tension is not included in the section name Many of the local override keys are duplicated therefore only a full explanation of the STDF and multi wafermap are included below The information in these sections also apply to the Summary Shmoo ASCII Datalog and Wafermap DLLs For example ENABLED True may appear in all of the local overrides but it is only explained in the STDF local override section STDF Local Overrides kdx stdf4 Local overrides header for STDF DLL Must match the name specified for the DLL in global settings only without the dll extension 368 PN 071 0359 02 October 2005 Datalog Engine and DLOG Engine ENABLED True Can be True False 1 0 Default switch for active or inactive If 1 TRUE the kdx_stdf4 dll is turned on by default This setting can also be changed in the DE Settings box in the STDF 4 check box FILENAME Yemachine id 6 Yeprogram name 6 96flow idYo 96lotname 6 Yostart time 6b 96d 96Y 96H96M96S 96 Local override for FILENAME Refer to the FILENAME explanation in DE Global Settings WAFER FILENAME Yemachine id 5 Yeprogram name 6 Yoflow idYo Yowafer id 6 96wafer numrint 0096 96time 6 Local override for WAFER FILENAME Refer to explanation of WAFER FILENAME in DE Global Settings FILE EXTENSION std Filename extension which is used for the output data file LOWERCASE FILENAME True Local override for LOWERCASE FILENAME Refer to the explanation of LOWERCAS
511. tered at the top of the waveform patch The text is taken from the marker label The title contains the pin name if pin name was defined and number of the pin that is digitized Only one title is displayed If more than one title marker is defined for a waveform the first title marker found is printed The X coordinate is used to order the title markers If more than one title marker is defined at the same location the order is determined by the order the markers were defined The Y coordinate is not used Cycle Marker A cycle is shown by a dashed line from top to bottom of the patch at the location specified by the X coordinate The Y coordinate is used to show which of the eight possible support modules provide the cycle timing This value is used to select one of eight colors for the display of the cycle boundary the eight colors are the grMarker1Color through grMarker8Color resources and can be redefined using the resource file Kalos 2 User Manual 249 5 KITE Utilities Cycle Count Marker The label text contains the cycle number of the displayed cycle It is positioned near the top of the patch just to the right of the vertical line Vector Marker The vector marker prints only text from the label field of the marker It is positioned at the marker X coordinate with other cycle related text The Y coordinate is not used The label contains the number of the vector for the current cycle Scan Marker The scan marker print
512. tes and the label printed near the cross hair In general notes include a multiline string that describes why that point is of interest Note you must hand edit the ASCII AWAV file to add these markers Generic Marker Any marker type not described above is considered to be a generic marker These markers are drawn as a diamond shape with a dot in the center of the diamond at the location of the X and Y coordinates The label is printed to the right of the diamond marker Note you must hand edit the ASCII AWAY file to add data for these markers Marker Control in CMD Files As an alternative to turning marker display on off using the menu system use the display marker command in a command file Command files have one of two file extensions cmd or aws To turn marker display on off using the command file 1 Open a command file 2 Using the syntax shown below enter one or a series of commands that control the marker display The syntax is display marker type on off where type is a string for the marker type Kalos 2 User Manual 253 5 KITE Utilities 3 Save the command file NOTE If these commands are included in the initialization file awtinit cmd the marker display is set up automatically when the Waveform tool is launched Example The following series of commands turn on the display of title cycle vector and compare markers and turns off the display of the others displ
513. than m Resolution pS the time interval between the two obtained sequential samples in terms of pS e Time Scale a conventional time scale factor refer to the Settings dialog Time nS the time corresponding to the current position of the mouse cursor in the waveform area in terms of nS LATool Window Context Menu The LATool window provides the following context menu Displays the Channels dialog to select the desired channels Channels Displays the Settings dialog to set the precision and the Settings waveform area scale Colors Settings of the colors Show Expected Shows only the expected states if checked Shows only the actual states if checked Show Actual Shows both the expected and actual states v Show Combined v Show Groups Shows hides the hex values of states of the groups Scope This Turns to the DSTool window for accurate measurement Open Displays the Open dialog box to choose and open the desired kai lat file Save As Displays the Save As dialog box to save the current data as a Jat file The Save As dialog contains the Save detailed info check box which is checked by default It allows the user to include or omit the data for the Detailed Information dialog see the Detailed Information Dialog 312 PN 071 0359 02 October 2005 Logic Debug Tool Expected Expected Failed Click Reset to reset the default colors used in the LATool Actual window Actual Failed
514. the end of lot message is signaled by the prober For handler testing the Stop button must be pressed to end testing When the Stop button is pressed the following dialog box appears Select Yes to abort stop testing or No to continue testing Kalos 2 User Manual 205 4 Introduction to KITE Kalos 2 Integrated Test Environment KNET Message pa Abort Auto Testing Production The Clear Device IF button unloads the software device and returns the tester to Direct Test 206 PN 071 0359 02 October 2005 KITE UTILITIES The Kalos Integrated Test Environment KITE software provides access to development debug and diagnostic utilities This chapter describes each utility and provides information on their functions and usage KITE utilities consist of the following e CView Console Viewer Utility Test Debugger TBUGGER Utility Kedit Utility e Waveform AWT LDTool DBM Editor DBMEdit Utility DLOGEngine Cal Diag Utility e ShowBitz Utility IDRom Utility e NVMDIB MAP INIT Kalos 2 User Manual 207 5 KITE Utilities Overview The Kalos Integrated Test Environment KITE software provides access to development debug and diagnostic utilities through a graphical user interface GUI Utilities can be opened launched by clicking on the applicable toolbar icon shown in Figure 132 or from the Utilities pulldown menu located on the menu bar of Front Panel Toolbar T
515. the Target Manager To remove the target manager right mouse click on either the target icon located at the bottom of your display or the pop up menu in Figure 68 Click on Exit targetmgr and viewer with the left mouse button Users are then prompted to confirm the request since the action closes the Font Panel application and terminates communication with the tester Kalos 2 User Manual 103 4 Introduction to KITE Kalos 2 Integrated Test Environment Loading Test Programs Projects in KITE Kalos test programs and projects are loaded onto the tester hardware through the Front Panel The Front Panel serves as a graphical front end to load and control execution of test programs projects Programs projects are loaded by choosing one of the load options from the File pulldown menu or by choosing one of the load button icons on the toolbar see Figure 69 This action invokes a browse window that allows the user to locate an existing test program project file Executable Kalos test programs have a kbi extension The Load Project Files kpj extension option like test program files loads a project file Double clicking on the selected file loads the program project kbi or kpj file Another load option Operator Interface is a one stop selection with execution load that allows either program files or projects to be loaded with the following selected options 1 Auto run DIB Cal 2 Datalog Engine 3 Sum Validation 16 or 32 c
516. the allowed pin types and available assignments Table 3 Pin Types and Tester Resources DUT Pin Type Pin Type Resource Designator Tester Resource Power pin PWR PIN DPS VCCO to VCC31 VPPO to VPP31 Ground pin GND PIN No connect NC PIN Input pin INPUT PIN DO D17 Tester Channel D18 D35 1 768 Output pin OUTPUT PIN OO O17 Tester Channel O18 O35 1 768 Clock pin CLOCK PIN NA Tester Channel 1 768 Address pin ADDR PIN XO X15 YO Y15 Tester Channel Z0 Z7 1 768 Input Output IO PIN 100 1017 Tester Channel Pin 1018 1035 1 768 Kalos 2 User Manual 45 3 Test Program Definition All signal pins must be mapped to a tester channel Power pins should be mapped to a device power supply DPS Ground pins and no connect pins do not require a channel or assignment NorE The N A means not assigned For example a CE pin is an unassigned pin while an address pin is an assigned pin Also DQ represents data which is the same as a bidirectional pin I O pin Use I O in place of DQ in your socket table When testing more than one device with a single Kalos 2 slice multi DUT testing the FLOW statement must always branch to a bin on a fail and all signal pins are connected to the same number of tester channels However this is subject to change in future revisions of software Although it is possible to use DPS1 etc for identifying a power supply using VCC
517. tion left sub slice is used to define the ALL for this DBM Pattern and up to eight segments The segments can be anywhere inside the ALL definition and can overlap one another The alternating A B A B DBM addressing is only a graphical representation of the current Kalos 2 SRAM 256 Megbit Note that the steering addresses are defined at the top of the slice 26 through 06 30 36 through 31 Bit 30 is the bank switching for this configured SRAM 346 PN 071 0359 02 October 2005 DBM Editor DBMEDIT Figure 206 DBM View and Override Buffer Memory M Data Buffer Editor Fle Leites Tods Heb Sia e mia 7 EMU Editor Hex ASCII Format OMNI1 Even Slice Hex Format Hex format defines a custom format Hex for viewing the DBM data of the selected memory buffer file The Hex format is an ASCII file Currently this is the only format that is supported by the Kalos 2 operating system 020000020000FC Extended Segment Address 020000040010EA Extended Linear Address 10000000FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFOO Addr 0000 Data Record 10001000FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFO 10FFFOOO0FFFFFFFFFFFFFFFFFFFFFFFFFFFFFFFF91 Addr FFFO Data Record 00000001FF End of FileRecord Figure 207 is an example that illustrates 16 byte count record with addressing for a 16 wide device Kalos 2 User Manual 347 5 KITE Utilities Figure 207 Translation Format Hex Data Buffer
518. tion brings up the MAP Initialization dialog box see Figure 223 that allows the user to select all slices most typical or any one slice To map the boards manually click on the Utilities pulldown menu and select MAP INIT Otherwise the interface automatically runs the mapping when the slice is set up by TTarget Figure 223 MAP INIT System Front Panel File View Options BEES Tools Help CVIEWER Dr AJA O de ex TBUGGER KEDIT IS o DBMEDIT MAP INIT DLOGEngine CAL DIAG SHOW BITZ IDROM Active slices ET NYMDIB Iw S SYSTEM MONITOR Program programHame js Device dewiceMame Oe soe Alpha numeric E Operator PXB pare MOLD ITE Kage Logi j Selection Selected Kalos Module B Breaktrap S C All Enabled Kalos Modules 418 PN 071 0359 02 October 2005 TEST DEBUGGER This chapter provides an introduction to the Test Debugger application This interactive utility allows the user to modify test program components including flow Sockets tests levels and timing data within a Kalos 2 test program and immediately return to program debugging without the need to re compile Kalos 2 User Manual 419 6 Test Debugger Introduction The Test Debugger TBugger utility provides the graphical user interface between the PC XP and the Kalos 2 tester The interface is a collection of viewers and controls that allow the user to control
519. tion measures the period if three edges are included in the region or pulse width if only two edges are included The user is prompted for the following parameters Mesial percent default 5096 Range the size of one bin in the level detection histogram Level Algorithm Mode or Mean Cross Count number of points above below a level for a valid cross Rising Falling Overshoot This function measures the overshoot on the rising and falling edges of the pulse The overshoot as a percentage of the pulse amplitude as well as the peak value and the location of the peak value are printed The user is prompted for the following parameters Range the size of one bin in the level detection histogram Level Algorithm Mode or Mean This function gives a settling time to the limits of the sample rate for a rising or falling edge One cursor is placed on the edge at the point from which the settling time is to be measured The other cursor is placed near the end of the pulse well after the signal has settled Kalos 2 User Manual 271 5 KITE Utilities Table 22 Pulse Function Descriptions Cont Menu Item Settling Time Function This function gives a settling time to the limits of the sample rate for a rising or falling edge One cursor is placed on the edge at the point from which the settling time is to be measured The other cursor is placed near the end of th
520. tion tool 451 521 configurations 529 Display Socket amp Setups property page 529 fail table 534 functions 521 Overview amp BIM property page 535 property pages 526 Scan setups property page 533 scanner operation 528 Search Tables property page 534 viewer 451 521 BitPower 114 board 542 board controller 542 bookmarks 67 break test 423 434 button 423 breakpoint 542 breaktrap 423 breaktrap settings 153 169 BreakFail 169 BreakMeas 169 definition 170 examples 171 Kalos 2 User Manual 555 Index set up and execute BreakFail 175 set up and execute BreakMeas 173 set up and execute LoopMeas 177 set up and execute LoopTest 176 set up and execute Pause 178 FAIL 171 LoopMeas 169 LoopTest 169 measurement 171 Pause Step 169 test flow 172 C C Kalos2 directory 26 KalosOS directory 27 C functions 40 Cal Diag 112 Cal Diag also see Calibration and Diagnostics 410 Cal Diag icon 198 Calculator Pane 255 calibration execution 410 programs 410 calibration fixtures 97 calibration programs 185 calibration diagnostic 185 Calibration Diagnostics also see Cal Diag 410 changing a waveform name 240 the interval 240 the number of samples 240 the waveform color 244 channel 542 characterization test 542 chart pie in summary 135 child directory 21 chip 542 Chn checker property page 442 clamp voltage 542 Clear button 256 clock 7 closing a wa
521. tions Utilities Tools Help 12 m0 d 5 5 00 t LR Es aaa Program Loading Once the editor is launched click the left mouse button on the File pulldown menu see Figure 137 From this pulldown menu a program can be selected for loading Options include New to create a new file Open to load a file Open Workspace to edit an existing file Additional options are provided to save print close and review recent files Refer to the Kedit section in the Test Program Definition chapter in this manual for in depth information on the Kedit utility Kalos 2 User Manual 213 5 KITE Utilities Figure 137 Kedit Text Editor Kedit LoopCntr test ktl File Edit View Compile Tools Options Window Help DEA aa eres elo o rr AA O Ara ax E LoopCntr_test ktl e GS Program a File Name LoopCntr test ktl BX KO AXIS fs BINTABL f CMODULE fa CONFIG Tr CONSTAN T CYCLE N KO CYCLE T KO DPSSET fs EDGESET Ta EVENT X Ta FLOW hh FSET TA f LEVELS Tr LOADDEM th PATTERN Ka PINGROU Tr PHUTEST Ta PSET TA Ts SEQUENC KO SHMOO KO SOCKET Ko TEST Ko TIMING Created by P Madison Date 7 29 02 Description This test the loading of LoopCounters loop0 1 2 amp 3 at LL RRRERR RAR RRE RRR ERE RR E EERE RR Y Y Y G d EEE R ERE REET RRR RETR REE REE REE Revision History 2 29 02 File created
522. tiwafermap Beginning of section of local overrides for the multiwafermap DLL This must match the name specified for the DLL in global settings without the d extension ENABLED True Can be True False 1 0 Refer to DE Global Settings WAFER FILENAME Yemachine id 6 96lotname 6 Yoflow id96 Yowafer num INTO29 6 96time 6 Refer to DE Global Settings FILE EXTENSION wmp Refer to DE Global Settings LOWERCASE FILENAME True Refer to DE Global Settings HEX MAP True Can be True False 1 0 Option to create wafermap that shows hard bins in hex HEX MAP WIDTH 1 Character width of each bin is represented in the wafermap This indicates how wide each bin location is and affects the appearance and the readability of the wafermap This is multiwafermap specific NORMAL MAP True Can be True False 1 0 Option to create wafermap that shows hard bins in decimal NORMAL MAP WIDTH 4 Character width of each bin is represented in the wafermap This indicates how wide each bin location is and affects the appearance and readability of the wafermap This is multiwafermap specific SOFT BIN MAP True Can be True False 1 0 Option to create wafermap that shows soft bins in decimal SOFT BIN MAP WIDTH 4 Character width of each bin is represented in the wafermap This indicates how wide each bin location is and it affects the appearance and readability of the wafermap This is multiwafermap specifi
523. to a specified threshold If the waveform amplitude is above the threshold the value is considered a logical high 1 If the waveform amplitude is below the threshold it is considered a logical low 0 The user is prompted for the following parameters Resample start point Resample rate and threshold Number of bits in the resulting parallel word Bit ordering MSB First or LSB First Where the result is displayed waveform the transcript pane or both Kalos 2 User Manual 273 5 KITE Utilities Table 22 Pulse Function Descriptions Cont Menu Item Parallel to Serial Function This function converts a waveform into a serial pulse train to create a bit stream for a serial DAC Save the file as a swav and input that to the serial DAC The TOS waveform is assumed to represent a series of parallel words one word per data point These words are converted into a series of pulses based on the number of bits and bit order At each data point the waveform value is rounded to an integer and the resulting twos complement integer value determines the bit values to put in the output waveform The user is prompted for the following parameters Number of bits per input value in the resulting serial bit stream Bit ordering MSB first or LSB first If a data point from the input waveform has a value of 5 the number of bits set to 4 and the bit ordering to MSB first the following
524. to zero 0 and its maximum is less than or equal to the size of the histogram waveform Thus if the size of the histogram waveform is 256 the original waveform should contain values between 0 0 and 255 0 Average Averages the TOS waveform The number of averages is used to determine the size of the resulting averaged waveform If the length of the original waveform is 1024 and the number of averages is specified as four the resulting averaged waveform has a length of 256 In this case elements 0 256 512 and 768 would be added and divided by 4 to produce element O of the resulting waveform Interleave Interleaves one or more source waveforms into one destination waveform Deinterleave Deinterleaves a source waveform into one or more destination waveforms Encode Converts data from a decoded RLONG or RRECT waveform to an encoded RLONG waveform which is then placed on TOS The operation transforms N bits of each waveform point using the specified data encoding Decode Decodes the TOS waveform according to the specified number of bits and the specified code format When the SWAV format is specified in the Save As dialog the code formats are listed in a drop down menu Selecting NATURAL BINARY causes no change in the data When selecting a law u law or BCD the number of bits parameter is not used 260 PN 071 0359 02 October 2005 Waveform AWT Table 18 Wf Math Functio
525. tober 2005 Breaktrap Settings Levels VccStandby hi LEVELS statement StandbyICChi VCCVPP DPSSET statement SET CECONTROL VIH set CECONTROL to VIL SET VCCO MAIN using levels in LEVELS SET VPP1 MAIN StandbyHIIcc VCCO PMUTEST statement MEAS PMU performs current meas on VCCO using the PMU y bi Example 2 The following section of code illustrates an example of a functional test The name of the test is Read CKBD all TEST Read CKBD all TESTNO 2000 DESC Read CKBD SEQUENCE VCC 5V VPP OV DPSSET statement Levels Read LEVELS statement READ FF STATE SEQUENCE statement cycle tablel read CKBD PATTERN statement PG RUN he H Set Up and Execute BreakMeas Breaktrap Setting Once BreakMeas is set on a selected test measurement the program executes all tests in the flow up to and including the selected test then waits for the user to click on the Start or Stop button or launch Kalos 2 application debugging tools such as Shmoo Test Debugger and ShowBitz If the user executes a shmoo plot every data point on the plot is the result of running the selected breaktrap measurement The Test Debugger tool reads the current test components and allows viewing and modification of them ShowBitz displays and allows modification of the contents of all hardware registers in the Ka
526. ton and standard save dialog Kalos 2 User Manual 357 5 KITE Utilities Figure 212 About dialog About Dlog Engine x Kalos Dlog Engine ET Copyright C 1999 2003 Credence Systems Corp Kalos Software dlog engine EXE kalos production ini kdx stdf4 DLL kdx ascii DLL kdx summary DLL kdx MultiWaferMap DLL kdx shmoo DLL kdx tpePrintf DLL compress stream DLL Save As un RIF PO PO PO PO PO PO O cU cre CEU coOcocococococoococrm NENA NA MU NP e NAN crTmcoooornoc HOP O ON D AD Le Postprocessor All standard datalog files are processed by a postprocessor User DLLs must include an applicable API call to invoke the desired function s refer to Create Custom Code Postprocessor can be a batch file or executable file By default there is one batch file def_move bat for all DLLs which copies generated files and sends them to this destination folder which can be a network folder All processed files and errors of file processing are logged by default and sent to the KALOS_ HOME test data_engine def_move log file The destination folder and the path name of the postprocessor file are set in kalos_production ini by DESTINATION_DIR and POSTPROCESSOR fields accordingly It is possible to use different postprocessors or copy files to different folders for each DLL However it is necessary to use local overrides of these fields in the INI file for these purposes DE passes several p
527. tory RAM 158 arm condition 165 control 158 debugging source code 76 Kedit 88 Store All Mode 165 Store Only Fail SOF 164 Store This Vector and Store Fail Only 164 trigger condition 166 home directory 21 host computer 16 I O channel 546 I O pins 5 IDROM 113 IDROM backplane 8 inhibit 546 Int Diff parameters 278 interface controls 20 26 user 20 26 interface board DUT 97 interface Front Panel 108 interpolation Cubic Spline 240 interval changing the 240 introduction 215 introduction Kalos 2 tester 2 Kalos 546 documentation xxviii Kalos 2 architecture 1 Kalos 2 documentation 57 Kalos 2 interface 12 Kalos 2 test system introduction 2 Kalos 2 User Manual 559 Index Kalos Active Slices 118 Kalos Integrated Test Environment KITE 20 95 110 207 208 Kalos Pattern Language KPL 37 Kalos summaries 134 Kalos Test Language KTL 37 KalosOS directory 27 KBI 546 kcal cal 185 kchk dia 187 Kedit 112 anonymous macros 66 bookmark tools 65 counter group format 89 datalog dialog 86 Debug tool functions 75 debug tools 66 74 debugging tools 77 file menu 60 Files tab 61 hex format data display 90 history RAM 88 navigating 64 71 pins option 90 pulldown menus 68 Resource Completion feature 72 resource icons 63 resource selection 87 source file location 88 standard tools 65 timing edge definitions 92 timing edge display 91 tool functions 66
528. ts key in INI runtime decode string kdx add runtime str file with runtime key const char key Key of string in INI of string const char Default runtime key of defaultValue string Gets runtime decode sont urrent value o kdx_get_runtime_str string value based on runtime decode string Parameters the key in INI file const char key Key of string in INI Current value of Adds runtime decode const char runtime decode string kdx add string value string with specified 7 const char key Runtime key of string runtime key const char buf String to add True Success False Fail const char key Runtime key of string kdx remove string v Removes runtime decode string Kalos 2 User Manual 401 5 KITE Utilities awir Current value of runtime decode string const char key Runtime key of string Kalos_production ini Parsing Functions Return Value Description of Function Name Description Return Value Parameters Parameters true Gets bool value from 0 false INI file considering 1 failed local overrides const char entry Key name in INI True Success Gets int value from Ka Fail INI file considering local overrides Destination buffer for int value True Success Gets float value from False Fail INI file considering const char entry local overrides p Destination buffer for float val float value rue Success Gets string value from False Fail INI f
529. tton statement is in the file that string is used as the button label If no appropriate file is found in this location the button is left undefined Button labels are assigned only upon initialization of the Waveform tool All commands recognized by the Waveform tool user command interpreter are listed in Table 26 int implies a decimal integer value double implies a floating point number that must include a decimal point and can include an exponent lt string gt implies a string To protect special characters including spaces strings must be quoted a string Apostrophes surround literals that must be entered exactly as indicated Values inside square brackets are options one of the literals indicated must be used Table 26 Commands recognized by AWT user command Interpreter Command Meaning abs Take the absolute value of top waveform on the stack add Add the top two waveforms on the stack add const double Add a constant to each data point in the top waveform on the stack apply taper window rectang triang hanning hamming blackman flattop fract double Applies the indicated window function to the indicated fraction of the TOS waveform apply kaiser fract double appErr double Applies a Kaiser window function to the indicated fraction of the TOS waveform with the specified approximation error
530. two cursors 1 From the two cursor drop down lists choose the two cursors you wish to compare 2 Usethe guide below to interpret the readings Y Delta Displays the difference in Y magnitudes of any two designated cursors X Delta Displays the difference in X values of any two designated cursors 1 X Displays the difference in X values of two designated cursors in terms of 1 X In other words if the waveform is in the time domain and the units are in seconds this field displays Hertz 1 seconds NOTE If two cursors are placed on top of one another the Y Delta and X Delta values are 0 0 and the 1 X field displays Infinite 1 s Also if either the X or Y units are not the same the delta boxes display the string incompatible units Name Pane Each waveform displayed has an information pane located along the left edge of the waveform window just below the delta information Characteristics about the waveform are provided in the pane An example is shown in Figure 151 Figure 151 Name Pane Stack Position 1 Name sing Samples 512 512 Interval fi00 00 n ols alupig Type PRESTO VALUE XScale 5 00 zu SE Div Y Scale 1 00 a 3 Div Color Superimpose On Kalos 2 User Manual 239 5 KITE Utilities Following are descriptions of all fields and buttons located in the name pane area s of the Analog Wavetool windows Stack Position
531. u items and a description of each function are shown in Table 24 Table 24 Windows Function Descriptions Function Applies a taper windowing function to the TOS waveform The user is prompted for the following parameters Windowing Function Fraction 0 0 1 0 Window functions include Rectangular Triangular Hanning Hamming Blackman Flattop Applies a Kaiser window to the TOS waveform The user is prompted for the following parameters Fraction 0 0 1 0 Peak Approximate Error in dB of resulting waveform Menu Item Taper Kaiser Chebyshev Kaiser Chebyshev Applies a Chebyshev filter window to the TOS waveform The user is prompted for the following parameters Fraction 0 0 1 0 Normalized Transition Width Ripple Main Lobe to Side Lobe Either the ripple of the side lobes or the transition width must be set to a non zero value The other of these two parameters must be set to zero Kalos 2 User Manual 277 5 KITE Utilities Int Diff Functions This option performs integration and differential Int Diff functions Note that after integrating a waveform the area can be determined by subtracting the magnitudes of two X values This is done by using the cursors Int Diff menu items and a description of each function are shown in Table 25 Table 25 Int Diff Function Descriptions Menu Item Function Simp
532. uct is grounded through the protective grounding conductor of the power cord or service wiring in lieu of a power cord To avoid electrical shock the grounding conductor must be connected to a properly wired receptacle or junction box To avoid injury to other personnel replace covers before leaving the equipment unattended Two or more persons may be needed to lift and maneuver equipment such as test head and rack mounted units because of their physical size shape weight or location To avoid injury do not attempt to handle this type of equipment alone Kalos 2 User Manual xxxiii About This Manual Electromagnetic Compatibility EMC System Requirements Immunity The use of hand held wireless communication equipment should be limited to distances in excess of ten 10 meters from the tester to avoid the possibility of erroneous data or misclassification of devices under test Accessibility of ESD sensitive devices and wiring in the vicinity of the test head requires that users wear a grounded wrist strap at all times Wrist strap ground points are provided at the test head and at numerous points on the main cabinet ESD wrist strap ground points are identified elsewhere in the system operator s manual Other ESD abatement practices should also be implemented such as the use of ESD abatement flooring conductive shoe straps ESD preventive coat ESD wrist strap connectivity monitors etc xxxiv PN 071 0359 02 Octobe
533. udes two screen displays Bitmap and MegaMap xxiv PN 071 0359 02 October 2005 Typographical Conventions The following typographical conventions are used to represent computer related information Menu Conventions Typographical Conventions This manual identifies menu bar submenu commands by referring to both the menu and the submenu item names For example instructions to choose the New command under the File menu item are stated as select File New from the pulldown menu Document Conventions This User Example courier Literal text appearing in a area length width program listing code or as displayed on a terminal screen bold Software commands entered tar cvf dev rmt 0 from the keyboard italic File directory and program Kalos program ktl names gt A series of a menu selections Kalos gt File gt Castaldi Project lt Label gt Represents a labeled key on the lt Return gt keyboard Keyboard Conventions This manual refers to special keys as shown in the following table This Key Means Arrow The keys labeled lt 1 gt and 4 Return The key labeled Return or Enter Alt The key labeled Alt Kalos 2 User Manual XXV About This Manual This Key Means Control The key labeled Ctrl or Control Shift The key labeled Shift space The space bar Mouse Actions This manual also uses the following terms for mouse actions Use the left mouse butt
534. udience i a al eA aha a ALA Skin lk ACCU AER ea xxvii Safety Consider ellofis ever beh ASAP ona AN a ER Cb e ER KAG xxviii Safety Statements 2 0 cse ke Ra ee EX URGE a ARRE KAWA Xxix Operators Safety Summary eene XXX Service Safety Summary AG xxxi For Qualified Service Personnel Only 00000 eee eee eee ee xxxi Electromagnetic Compatibility EMC System Requirements xxxii IMMUNI ic AE ee ke Res CR eee ART Rn xxxii Kalos 2 Hardware Configuration cece eee ee eee 1 Introd ctione Er en ha i Ce UD cc i o dn VOL P AA 2 Kalos 2 Test Head a csse Rs Ree e ace dee We d Pe X eb eae ea d d 5 VO Pin Configuration eS RO bed Rane RRM ee ke Rhee EROR AA ACH RR RC URL n 5 Backplane and Wiring 23 sock pro Ce EE RR LR e 7 Power and Ethernet Connection 0c cece 7 Main GlOCK miso casadas Edo EG UC back dba otek ence ia 7 Backplane IDROM coc 8 Test Head Opening Mechanism sels 8 Test Head Power Shutoff Switch llli 10 Tester Cooling cssc nea teeter ence Ce RR ARA ARA 11 DUT and Interface 2 rh 12 Kalos 2 Server s 14 EMO and Test Head Switch llli 14 AC Controller BOX ee 15 AC Configuration x ne deoa d PERRA KKK KAR Shea ERR GR Rin 15 HOSUPG CC 16 Kalos 2 User Manual Main Board 2 cei nce LEG ANO t eoa fod date ecco ice es anat bd AR wee ene 17 Hardware Configuration aaa a eee nn 17 E
535. ues on the fly NOTE You can only debug one slice at a time Choose the slice by clicking on the slice you wish to debug under Debug Slice in the Breaktrap Settings area on this property page A visual diagram showing each breaktrap setting is provided in Figure 108 Kalos 2 User Manual 169 4 Introduction to KITE Kalos 2 Integrated Test Environment Figure 108 Breaktrap Settings BreakOnTest Pause button Test block A BreakMeas LoopTest MEAS od LoopMeas Pass Break Test Sequence Fail Implementation Test Following is the definition of the Breaktrap Settings as defined by the Kalos 2 Test System Test is the execution of each item in its SEQUENCE NOTE Test in the Kalos Test Language is a point in a test flow It contains a test number a description of up to 80 characters and a SEQUENCE The SEQUENCE can contain names of resources data which are applied to the tester actions taking a measurement setting a delay running stopping the pattern generator executing a PAUSE setting a power supply pin or pingroup to a state and the names of C functions declared in a CMODULE statement In Example 1 on page 172 the execution of the IccStandbyHi test implies execution of every item between the open and closed brackets of the SEQUENCE Levels VccStandby hi StandbyICChi VCCPP SET CECONTROL VIH SET VCCO MAIN SET VPP1 MAIN Stan
536. ule or Marker Color To specify the background graticule or a marker color 1 Click the marker color button in tools Options Display window See Figure 140 2 Using the color palettes slider bars and color value fields choose or create the background color from the Choose a Graticule Color window as shown in Figure 141 224 PN 071 0359 02 October 2005 Waveform AWT Figure 141 Marker Color Window Graticule Color Recent Preview a a LI Sample Text Sample Text Sample Text Sample Text Cancel Reset 1 Click OK 2 Click OK again CWaveform Colors To turn automatic color incrementing on off 1 Select or deselect the Cycle Waveform Colors checkbox from tools gt Options gt Display window With the feature turned on successive waveforms pushed onto the stack appear in different colors If the feature is off automatic color selection is turned off and the color is reset to the default color selection 2 Click OK Maximum Waveform Display To set the maximum number of waveforms display 1 Enter a value for X in the Display Waveforms Max item in tools gt Options gt Display window 2 Click OK Kalos 2 User Manual 225 5 KITE Utilities Log Results in the Script File If scripting is turned on the option of writing comments to the currently open script file is available With this logging feature on any wave tool function that prints results in t
537. um INPUT PIN NA 47 95 Bb FLOW vcc PUR PIN DPS vec1 Multi DBM flow VPP O PUR PIN DPS VPPO K2 tine Shmoo flow VPP PUR PIN DPS VPP1 2lfc Yusers pmadison Kalos2 OS gdb tarmar kan 192 176 168 1 Compiler Dutput Find in Files For Help press F1 Pingroups A pingroup is a user defined collection of related pins see Figure 29 The PINGROUP statement assigns a unique name to the pingroup and lists the device pins or other defined pingroups to include in it Defining pingroups is useful when there are several pins that are often used together in a test program for example pins that are part of a bus Instead of listing each pin individually all can be specified with one entry This makes the test program more reliable reduces its size and decreases execution time Kalos 2 User Manual 47 3 Test Program Definition Figure 29 Pingroups cy Kedit Intel16M O File Edit View Compile Tools Options Window Help DpH SBE WS CBHX He AN je u PIN GROUPS LPPRAAAAAATAR ARTA TAR TATA TA TAA TA TTA TA TAT AA TTT TAT ATTA TTT TTT amp Intellen ket PINGROUP ALLPINS 40 A1 A2 A3 A4 A5 A6 A7 48 49 A10 A11 A12 13 414 A15 416 A17 418 419 420 DQO DOL Doz DO3 DQ4 DOS DQ6 DQ7 DOS DQ9 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15 CE O CE 1 0E WE PINGROUP ADDRESS A0 1 2 43 A4 A5 A6 A7 8 49 410 411 12 A13 A1
538. umulate toggle button in the Shmoo Display property page The resulting accumulation can be displayed interactively at any specified time When accumulate mode is enabled the current status of the accumulated data is displayed in the shmoo graphic area The total number of devices accumulated is shown below the Accumulate button This counter increments only when the following is true Accumulate mode is enabled The selected comparison status is equal The selected shmoo plot is completed Two types of accumulate plots are available accumulate percent and threshold by categories Each is shown in Figure 263 and Figure 264 476 PN 071 0359 02 October 2005 Setting Up the Shmoo Plot Figure 263 Accumulate Passed Percentage Plot Program filename Ser 1 Lot 1 mon day year time Comment user statement Level tablename Time tablename Pattern sequencernam X Axis VariableName Start 10 00nS Index 0 500nS Steps 35 00nS Y Axis VariableName Start 5 000 V Index 0 125 V Steps 1 000 V Accumulate Passed Percentage Plot Tested 250 Space 0 5 50 595 100 5 000 V 4 000 V 3 000 V 2 000 V 1 000 V 124506 XX KKK kk kk kk KK KK KK KK KKK KK KK KKK KK KK 11234506 X kk kk kk kk KK KK KKK KK KK KKK KK KK KK KK 346111 k KKK kk kk KKK KK KK KK KK KKK KK KK KKK KKK 4561777 KKK KK KK kk k kk KK KK KK KKK KK KK KKK KK KK BOTT KKK KK
539. unctions 0 0 00 c cee rne 278 Working with the STACK sues BANA KG KAMAG xb ace ek STR ead cee ka ad 279 Storing Recalling a Waveform 0 0 eee ee 280 Saving a Waveform acu ots Cea See ded P e tcn san c uous a dte mo ed oes 280 Creating and Executing SONS ccwsca rhe RR RR eek ba kaka ER ER RAUS 281 Monitoring Errors Warnings and Comments o ococcccccc 283 Entering a Shell Command AG 285 Executing Script Files A Closer Look lille 285 Printing a Waveform aa idus aka los doa ca abe Bh GR dca n clc p cds 298 Kalos 2 User Manual vii Closing a Waveform 2 uu iuc aede e Cc bcati AA 298 Exiting the Analog Wavetool ee 298 Logic Debug Jool Pr 299 LDTool Window so 222224244420 RARER ELE AR Rete DRM Ee ROR KAKA 299 Waveform Window Xa kaa echoes te a soe dre M e dO 307 Change Scale Dialog i cc reu eie gle yee Rn xt ete pa a t RR ele ce 308 Bonos s rr 308 Expanded Pin Group 2 rs 309 Collapsed Pin Group een 310 Waveform Area Conventional Symbols illis a 310 Additional Information illie 311 EFSTOO WINDOW amma qoum iR RP ae E KONG xa o Sacr acd gd eund addo 314 Setup Group 0 0 0 es 314 Datalog Window 2 educa Rom ap KAKAI KA Realy eee bee KAN REA TERENA 316 Detailed Information Dialog lt lt lt lt lt lt lt eee 323 Toolbar of LDTool ke ken BEKE BAKLA ce ens IRE oe eee KAKB a ex ees ES 324 Save Di log A a e eiaa aaa Ta oi
540. urn kdx register callbacks void mandatory kdx return kdx initialize void optional kdx return kdx shutdown void optional kdx return macro defines the function as a callback function which returnsint type Usually a 1 is returned These functions are called by DE EXE to perform specific actions kdx initialize is called at test program loading and can be used for DLL data initialization purposes e g reading INI file settings kdx shutdown is called before DE closing DLL unloading and before kdx initialize at test program loading It can be used to close the file generated by DLL kdx register callbacks is called to register DLL callback functions with standard events refer to Standard Event Functions in DE DE EXE calls registered functions when the event occurs bool kdx add callback const type char CB FuncName const dlogType 0 MSG EMPTY where type type of the event CB FuncName name of the function to call dlogType type of datalog message only for datalog messages functions Standard Event Functions Standard event functions are used to register functions using kdx add callback Registered functions must have kdx return macro as a return value Parameters of these functions are shown in Table 29 Kalos 2 User Manual 381 5 KITE Utilities Table 29 Standard Event Functions Event Description Parameters Description of Parameters taro Tot vod
541. urns full path of Destination file path file destination file void kdx gel output dir Returns directory for Output file directory Space LO Destination fil kdx get destination Returns directory for const char SSUNAHON IRE IS directory dir destination file Runs postprocessor for specified file kdx runBatchFile peral Device XY Coordinates Information Return Value DESCTIBHONLOT Function Name Description Return Value Parameters Parameters Returns minimal X Minimal X coordinate on wafer Returns maximal X Maximal X coordinate kdx get max x coordinate of device Returns minimal Y Minimal Y coordinate kdx get min y coordinate of device Returns maximal Y Maximal Y coordinate kdx get max y coordinate of device Kalos 2 User Manual 399 5 KITE Utilities True Success False Fail device n Y coordinate of device Gets device testing Destination for results based on i i software bin number device XY or NULL coordinates on the Destination for wafer int hbin hardware bin number or NULL Destination for site number on module or NULL Destination buffer for int dieNum device sequence number or NULL Pointer to XY node Multi node data for x y location Refer to X coordinate of j device multiwafermap for an E example Y coordinate of device Runtime Decode String Functions The general parameter for runtime decode string functions is a k
542. us configuration if it existed earlier refer to Configuration Transferring from Previous Installation These steps conclude Data Engine setup Setup process can be interrupted at any step by pressing Cancel and then Exit Setup buttons Configuration Transferring from Previous Installation If a previous version of DE installation exists the old configuration files kalos production ini def move bat Kalos startup bat are not replaced by the new DE installation The newer versions of files are installed in the same directories with other names representing versions for example Data Engine 2 0 3 4 becomes kalos production2034 ini def move2034 bat Kalos startup2034 bat After installation users can transfer the previous configuration to the new installation in several ways NorE Newer versions of DE may have configuration files with additional fields Ifthe installed version of DE is the same as the previous version no actions are necessary Kalos 2 User Manual 363 5 KITE Utilities e If the version is changed and there are minor and known changes in the configuration files it is possible to recreate the changes manually in the new files using previous files as references Replace previous files with new ones e If the version is changed leaving the previous kalos production ini file is recommended If the newly installed DE is an older version new fields are ignored If the newly installed DE is a newer version
543. users to find the PASS FAIL transition point while test conditions are changed One AXIS can change several resources For example the VLOG statement can ramp the strobe time from a short time to a long time to determine when an output goes to the expected logic level This value can be saved in a variable and displayed or used to make runtime decisions PATTERN The PATTERN statement specifies the source file of the test patterns where in memory to load the test patterns and what to do if a fail occurs The pattern data source file is referred to by its file name and must be in the same directory as the test program at load time LOADDBM The LOADDBM statement causes an Intel hexadecimal HEX object file to be loaded into the Data Buffer Memory DBM in either MEM A or MEM B This is only performed once at the time the KTL test program is loaded Multiple files may be loaded and are stored in a DRAM file system Kalos 2 User Manual 55 3 Test Program Definition SEQUENCE The SEQUENCE statement provides a way to define a test sequence external to the TEST statement Sequences may be embedded in other SEQUENCE statements such as in a SEQUENCE parameter in a TEST statement CMODULE KTL supports the use of C programming code within a test program by referencing it using the CMODULE statement This capability provides the user with access to the full power of the C programming language and the standard ANSII C library EVENT MAP
544. veform 298 CMODULE 40 CMODULE statement 40 CMOS 542 color background 224 graticule 224 marker 224 colors shmoo 458 command interpreter 285 comparator 542 compare 542 compare edge marker 251 complex rectangular waveforms 279 compliance voltage 542 components for waveforms 242 composite All summary 133 composites accumulate mode 470 computer host 16 Concatenate button 256 CONFIG statement 56 configurations 1 Console Viewer CView 183 Console Viewer see CView 209 CONSTANT statement 54 446 continuous active load 542 control area shmoo 456 controlling markers in CMD files 253 converting spaces in filenames 227 cooling system tester 11 CPU module ETX 18 creating a cursor 234 a waveform 228 scripts 281 cross count 270 cubic spline interpolation 240 current summary 131 current test program 126 cursor boxes 233 cursors attaching 238 changing the color of 236 changing the name of 236 creating 234 find level 236 grabbing 237 modifying 235 moving by using the box 238 manually 237 removing 236 set track 237 working with 233 zooming to 236 CView 209 menu and toolbar 210 CView Console Viewer 183 209 CViewer 112 cycle count marker 250 cycle set marker 250 cycle time 542 cycle waveform colors 225 CYCLE_NAMES statement 54 556 PN 071 0359 02 October 2005 DAC Module 543 data collection 543 Data Engine 354 data logging 543
545. viewer has interactive control of Bitmap configuration and display settings The base of the SRAM conditions is the current socket definition If the width of the device being represented is smaller than the definition of the original socket definition a pop up message informs the user that the configuration is not supported NOTE The Overview amp BIM Viewer property page Overview sub page has no interaction with the Bitmap operations 536 PN 071 0359 02 October 2005 Bitmap Figure 311 Overview Property Page Block Diagram Enhanced Memory Unit EMU area Support Matrix area Source Selects area Mmmm Dixplay Socket A Setups TITI Bitmap s Support Matrix Enhanced Memory Leit EMU1 DUT Width BY8 Y Addresses 5 7 Bug sooo credence KALOS 2 ENU MEMA Addresses MEM Size min DUT s min Kalos 2 Bitmap Selected Display Configuration Hardware Readback by Width wu MEM Size max DUT s max NN lez 4 Selected Display area The bim Viewer subtab property page shown in Figure 312 allows the user to load and view a bim file Text block information is read bitmap can be viewed or users can return to the top level bitmap to see the graphical representation Editing functions cannot be perform on this page Kalos 2 User Manual 537 7 Shmoo and Bitmap Tools Figure 312 bim Viewer Bitmap Application fie Edt View pwrs Utibes Took Hep SO 60 5 mcm m t
546. viewing the results of running stored patterns in History RAM The LDTool displays the correspondence between pattern and History RAM fail data failing pins and fail counts and allows bitwise editing and rerunning of patterns for acquiring new fail data LDTool automatically detects the LVM mode and displays it in the status bar of the main LDTool window The following LVM modes are supported 48x1 48x2 96x1 96x2 96x4 192x1 and 192x2 384x1 384x2 384x4 768x1 768x2 and 768x4 The LDTool utility is launched by clicking on the Kalos Logic Debug icon see Figure 165 or it can be selected launched from the Utilities menu item Figure 165 LD Icon Click here to open the Kalos Logic Debug utility p a MB oov Ema Bl D M 1 The main window of the LDTool operates in the following modes LDTool Waveform LATool DSTool Datalog The desired mode is selected by clicking the corresponding tab at the bottom left of the main window see Figure 166 LDTool Window The main LDTool window Figure 166 displays the currently loaded pattern and allows bitwise editing and rerunning as well as displaying the newly acquired fail data Kalos 2 User Manual 299 5 KITE Utilities Figure 166 LDTool Window Logic Debug Tool DAR File Action Edit View Options Help ane show BE ES W 62H egl o B ES zz O an a A A A UE Y CHANNELS o Addr Vector I
547. views with their respective components Table and graphical views are available 5 Status bar Displays messages and status Figure 226 Test Debugger Primary Main Window K ym Application ti Tools Heb wg QO Program K2_Shmoo_Fmt Timings DPSPMU Setups DPS Patterns Multi DPS pat DAO Multi VXX pat DO1 Multi LONG pat DQ2 pat DQ3 Valuelog Tables Levels CHooks ssEdgeSet noop blk Level nominal noop Level individual EdgoSot PassiOs pass Jos i e 07 Sequences PMU ail DOT dbus ILIM sequence gt gt EdgeSel FailDQ2 fail DQ2 EdgeSet FailDQ3 Q3 foil D EdgeSet edgesetCommc Constants Variables v 110 v 120 v x20 422 PN 071 0359 02 October 2005 Test Debugger Application Test Debugger Application The Test Debugger utility is an application consisting of two modes of operation for its respective functions Breaktrap or Selected Breaktrap requires the Front Panel to set a breaktrap thus enabling it to read get the current test components and allow for viewing and modification set of these components Selected allows the selection of data and or table data from the loaded program for viewing and modification set of these components Online mode of operation is the only mode available when using the Test Debugger All editing property pages have some common operations for getting setting and selecting the respective resource slice for editing These oper
548. voltage level 1 to a low voltage level 0 after the change starts Amplitude Magnitude of variation in a changing quantity from its zero value Offset Relative location from zero on the Y axis at which to begin the drawing of the waveform The Gaussian noise waveform parameters are described in Table 13 Gaussian Noise Waveforms Parameter Name Meaning Name associated with the waveform wavelet Num Samples N Number of samples to take in one cycle Sample Interval 1 Fs Time that is to elapse between samples Seed must be odd Starting value that will be used to randomly generate the waveform Mean Average value of the total number of waveforms Standard Deviation Average amount of variance from the mean The DC waveform parameters are described in Table 14 232 PN 071 0359 02 October 2005 Waveform AWT Table 14 DC Waveforms Parameter Name Name associated with the waveform wavelet Num Samples N Number of samples to take in one cycle Sample Interval 1 Fs Time that is to elapse between samples Offset Relative location from zero on the Y axis at which to begin the drawing of the waveform Opening a Waveform File Opening a waveform file loads the file at the top of the stack To open a waveform from a file 1 Choose File gt Open or click the Open File icon on the toolbar 2 In the Files of Type field speci
549. warm up looping the kchk must be performed before running calibration Mapping Active Kalos Slices Before running maintenance software the active Kalos slices Kalos boards must be mapped The Kalos 2 Active Slices boxes see Figure 99 are located on the Front Panel window A box representing each test board in the test head should be reflected If not there may be a problem with communication between the boards and the CPU or possibly a power supply problem with the Kalos board in the test head 198 PN 071 0359 02 October 2005 Running Calibration The MAP INIT selection brings up the MAP Initialization dialog box see Figure 130 that allows the user to select all slices most typical or any one slice To map the boards manually click on the Utilities pulldown menu and select MAP INIT Otherwise the interface automatically runs the mapping when the slice is set up by TTarget CAUTION Map INIT will erase the dibcal values Figure 130 MAP INIT m System Front Panel HBAS BO H m KEDIT DBMEDIT MAP INIT DLOGEngine CAL DIAG SHOW BITZ IDROM NVIMDIB ACHNITTZOE EM MO TOR Fit Soft Keys Active slices Active Slices Bank B FKS FKE i SAPRA 4 me MAP INIT aes Program programH ame Device deviceHame Lot o Alpha numeric Operator DIE pare MOLDE TIU p RUE M vid Selected Kalos Module Kalos A00 All Enabled
550. was an expect data high which is the TG data H L Indicates the expected format for the data was an expect high although the data retrieved from the device was low This means the first entry is the expect data and the second entry is the actual data retrieved This entry always appears in the color red indicating a difference between the expect data and the actual data or a failure for that particular device pin L H Indicates the expected format for the data was an expect low although the data retrieved from the device was high This means the first entry is the expect data and the second entry is the actual data retrieved This entry always appears in the color red indicating a difference between the expect data and the actual data or a failure for that particular device pin Kalos 2 User Manual 91 3 Test Program Definition Figure 59 Timing Edge Window Tt 54 ba ba bd bi EIE M bi EIE M bi EE M bi EIE M L E H L NEVER e rede 7 es z ESTE PN BN a MS E Zw m E F3 KA ER 7 a MH ES a RB ROS WoW oec ea Men 0 kac 22302 ee GAAN BOR NU e a E IAEI um x SE parus 7 za PUES Ll NG oe Sa ml TS A dci LEE a MAN KOMA AA RENS NEN xal Anes 0 AN laci rd O s E mai ps i Ew ms sabe gjj M Testing When the cursor is placed over an edge a window appears showing details of the expected actual failed and strobe information see F
551. waveform extends vertically beyond the edges of the graphic pane or there are more waveforms that are fully displayed in the graphic pane vertical scroll bars appears to the right of the waveform s NOTE If there are more waveforms than fit on the graphic pane an additional vertical scroll bar that spans all of the patches appears However this scroll bar has no scroll menu To scroll a waveform along its Y axis vertically Click and drag the scroll box up and down Dl Click above or below the scroll box fastest method OP Kalos 2 User Manual 245 5 KITE Utilities Click the up and down arrow buttons at the ends of the scroll bar To scroll a waveform along its Y axis using menu options 1 Right click in one of the vertical scroll bars 2 Choose one of the nine options below to position the waveform as desired Scroll Here Scrolls according to where you click on the scroll bar Location Scrolls to the Y axis point you specify Enter a value and click OK Top Displays the top of the waveform Center Displays the vertical center of the waveform Bottom Displays the bottom of the waveform Page Up Scrolls up the waveform using the height of the patch as the scroll increment Page Down Scrolls up the waveform using the height of the patch as the scroll increment Scroll Up Scrolls up the waveform in very small increments Scroll Down Scrolls down the waveform in very smal
552. wi wiwiwi wi wiwi d ALE EE Pu mim wiwiwiwiwi wi P P User can point to any cell of the TG field and see the corresponding states at T1 T2 T3 and T4 in a pop up tip Right click any cell and select Detail from its context menu to turn the TG field to Detail mode Figure 186 320 PN 071 0359 02 October 2005 Logic Debug Tool Figure 186 Detail Mode MM pa bi xc x x ba Na i KiK MM M MI MIK bi MOM XML pa pa pa pa E played for each pin and the cells of the TG field show the states according to the mnemonic symbols presented in the last column of Table 28 Kalos 2 User Manual 321 5 KITE Utilities Table 28 Mnemonic for 6 Bit of TG Fail Latch E ted Actual i Ch hit ui MGE ee ie DR ERN po fo fof of 1 Lain ol a pat a fo of a EME EA Ear EET ARA Lo pa Noa a po po fofa 1 ofa o if po fo fo fo NE XH RECEN Mnemonic Exp Act H High M Midband HM G Giteh X Don t Care In the Detail mode users can point to any cell of the TG field and see all the six bits of the fail latch Figure 187 322 PN 071 0359 02 October 2005 Logic Debug Tool Figure 187 Detail Mode pa MM T pa pa ba pa pai pa MM MM EM LM MIMIMIM Mi MMM ibd iba i ba i bd i bd i be Mimimimimimim pi pi r 54 pi 54 54 bi ba pa A AA fe AA Aa Detailed Information Dia
553. wing parameters Name Sample Interval Start Frequency Stop Frequency Number of Samples Band Stop Creates a band stop notch digital filter The user is prompted for the following parameters Name Sample Interval Start Frequency Stop Frequency Number of Samples Kalos 2 User Manual 275 5 KITE Utilities Table 23 Filter Function Descriptions Cont Menu Item Function C Message Creates a C message filter A C message filter is essentially a band pass filter These filters are used in testing telecom devices The user is prompted for the following parameters Name Sample Interval Number of Samples Psophometric Creates a psophometric filter A psophometric filter is essentially a band pass filter These filters are used in testing telecom devices The user is prompted for the following parameters Name Sample Interval Number of Samples Brick Wall Creates a brick wall filter waveform The user is prompted for the following parameters Name Sample Interval Start Frequency Stop Frequency Number of Samples NOTE To use the filter waveform in a convolve operation the sample interval must match the sample interval of the waveform to be filtered 276 PN 071 0359 02 October 2005 Windows Functions Waveform AWT Windows operations enable users to apply various window functions to the TOS waveform Window men
554. without the covers and panels installed Refer installation to qualified service personnel To avoid explosion do not operate this equipment in an explosive atmosphere unless it has been specifically certified for such operation xxxii PN 071 0359 02 October 2005 Service Safety Summary Service Safety Summary For Qualified Service Personnel Only Also refer to the preceding Operators Safety Summary Do Not Service Alone Use Care When Servicing With Power On Do Not Wear Jewelry Power Source Grounding the Product Replace Covers Lifting Do not service or adjust this product internally unless another person capable of rendering first aid and resuscitation is present Dangerous voltages and currents may exist at several points in this product or in the equipment with which this product is used To avoid personal injury do not touch exposed connections and components while power is on Disconnect power before removing protective covers and making internal changes Remove jewelry prior to servicing Rings necklaces watchbands and other metallic objects could come into contact with dangerous voltages or currents This product is intended to operate from single phase 3 phase for Kalos AC power source 200 240 VAC 40A 50 60 Hz The power source may be L1 L2 ground or L N ground Refer to the installation instructions before attempting to connect the product to the power source The prod
555. xecutes in order until a failure occurs or all items are completed Refer to the SEQUENCE section in the Kalos 2 Test Language chapter of the KITE Reference Manual for a list of available actions Figure 31 DC Tests cc Kedit Intel16M CO File Edit View Compile Tools Options Window Help Dm u 0 i fa TEST Opens Shorts InputLeakageHigh InputLeakageHigh PMU InputLeakageHigh PPMU InputLeakageHigh PMUL InputLeakageLow OutputLeakageHigh OutputLeakageLow IccStandbyLow IccStandbyHi VCCReadICC CMOS VCCReadICC TTL OutputLeakageLow Erase array Erase array l Erase array 2 Erase array 3 Read all ff Read all ff 1 test fail test Read all ff SYNC Read all ff bof Readff cont Read all ff 2 Read all ff 3 4m Nana 21 ec ven ma Program Bi xi H euo TEST OutputLeakageLow TESTNO 600 DESC Leakage Low Test for the output pins SEQUENCE high vcc vpp dps output leakage lo seq output leakage lo levels outputleakage lo pmu MEAS PMU nG hi TEST Erase array TESTNO 1100 DESC erase the device gt all addresses OXFFFF SEQUENCE vcc 5v vpp 12v dps erase levels power up seq erase state sey cycle tablel clrreg pat PG RUN resetdut pat PG RUN erase pat PG RUN zero levels zero vcc vpp dps NG Find in Files Compiler Dutput For Help press F1 Ln 2108 Col 1 Not connected 50
556. xisting ones Refer to DOS batch file documentation for the script command syntax Type help from a DOC command shell for a list of commands Collecting Log Files for Debugging DE has the capability to create log files These files can be used for debugging purposes The primary one is datalog binary file Other files are supplemental Datalog Binary Dump File DE receives data from the datalog and saves it to a datalog binary dump file without any changes This allows users to recreate the DE state later It is advisable to enable this option if problems with DE are encountered It is commonly used for customer support purposes This function is enabled and adjusted using BINARY_ENABLED COMPRESS_TYPE BINARY_SPLIT_LOTS ADD_BIN_HEADERS BINARY_DIR DISK SPACE LIMIT and BINARY ROTARY fields in kalos production ini refer to DE Global Settings The datalog file can be collected with real time compression COMPRESS TYPE is 1 This saves hard disk space significantly The option must not be used in the crash condition as a ZIP file is not readable The ZIP file must be closed by switching the Binary Dump checkbox to off on the Settings dialog Kalos 2 User Manual 359 5 KITE Utilities If the file was created using real time compression decompressing the created file and compressing it back with third party ZIP or RAR compressors is recommended This provides higher compression rates The purpose of the DE compressor is to p
557. y the last recorded macro N times Dialogue box prompts you to indicate how many times Save Anonymous Macro Save the last recorded macro to a file Online Offline Online mode enables debugging through Kedit Offline mode enables test program modification and compiling Load Project After selecting a slice load the Kalos 2 project file Load Program After selecting a slice load the Kalos 2 test program Start KTL Debugging Enables debugging for the last loaded pattern Run PG Allows the user to burst the last loaded pattern in debug mode Stop PG Stops pattern burst in debug mode Insert Remove Breakpoint Toggles breakpoint at the line where the cursor is positioned Kalos 2 User Manual 67 3 Test Program Definition 37 Start Continue Test Starts or resumes testing after a breakpoint 38 Step over Execute the test element at cursor location 39 Step into Execute the test element one level below cursor location 40 Step Out Execute until next test element one level above cursor location 41 Clear All KTL Breakpoints Remove breakpoints from all lines in test program 42 Clear All C Breakpoints Remove breakpoints from all lines in C file 43 Stop test Stops the test 44 List of active modules The first step in debugging is to select the Kalos 2 slice where debugging is to occur Pulldown Menus In Kedit pulldown menu options are available see Figure 39 which allow the user to
558. ystem pin definitions channel number and assignment type Figure 307 Online Socket File Property Page a ela ll a A Display Socket amp Setupr Online Socket Onine Socket Fue Deine 28 Dispi Width rae ented IL Steering Socket Tablo Update SOCKET X to Display by Kalos 2 User Manual 531 7 Shmoo and Bitmap Tools Display The Display Socket File shown in Figure 308 provides a bitmap display that allows you to configure the bitmap to the display by parameters rows columns and l O s Clicking on the Display Socket File button updates the display to reflect your selections The socket table has multiple uses with the main use of reading a vlg file into the tool to check and ensure pin and or pingroups are in sync in the Setups Besides providing a compare table for the internal checks this property page allows for Offline generation of Setups with validity checking Figure 308 Display Socket File Property Page Bitmap Application Fle Edt View Options Utilities Toos Hep EE Sia m M Nw mw t Socket Table Filler only Generated by Display by Rows Columns amp 1Os Definitions re oo 0 ow wo oz wm 65 e E wi 1 6 x xw ez 5

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