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E8000 SH7612 Emulator Diagnostic Program Manual

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1. When the diagnostic program is executed the E8000 emulator will halt at the following message and wait for command input TEST12 DIP SW TEST COUNT lt 001 DIP SW1 2 0092 DIP SWITCH 1 2 5555 SET OK Y N After setting the DIP switches as shown in figure 4 3 1 enter Y If no error occurs the following message is displayed TEST OK The E8000 emulator will halt again at the following message DIP SWITCH 1 2 AAAA SET OK Y N After setting the DIP switches as shown in figure 4 3 2 enter Y 18 7 Tf no error occurs the following message is displayed TEST OK 8 The E8000 emulator will halt again at the following message DIP SWITCH 1 2 0092 SET OK Y N 9 After setting the DIP switches as shown in figure 4 3 3 enter Y 10 If no error occurs the following message is displayed TEST OK Note RET RETURN key 1 DIP switch seting 5555 Figure 4 3 DIP Switch Settings 19 Diagnostic Program Output Example ES000 EVCHIP Test E8000 EMULATOR TEST MAINTENANCE PROGRAM DIAG SYS Version No x xx mm dd yyyy xxx indicates the version number Copyright C Hitachi Ltd 1997 Please key in TEST PARAMETER OPERATION TEST EXECUTE Y N N RROR CONTINUE Y N N EST MODE SELECT E8000 ONLY 2 E8000 EVCHIP E8000 EVCHIP FIXED USER TEST MODE 1 2 3 2 DEVICE TYPE SH7612
2. ESTO9 JTAG TEST COUNT EST10 CONT REG TEST COUNT EST11 IDR READ TEST COUNT ID CODE FCFE PC I F BOARD DISCONNECT TRC BOARD CONNEC DCONT BOARD CONNEC EVCH BOARD CONNEC LAN BOARD DISCONNECT EST13 TRACE REG TEST COUNT EST14 TRACE RAM TEST COUNT 1 PAUSE TES OK 2 MARCHING TEST OK TEST15 PARALLEL RAM TEST COUNT 1 PAUSE TES 2 MARCHING TEST OK TEST16 EBOX TEST COUNT 1 EBOX ID CODE OK 2 EBOX ID CHECK OK 3 SHARED RAM TEST OK 4 WORK RAM TES OK 5 ULSR TEST OK 6 MAPR R W TES OK TEST17 ERAM WINDOW TEST 1 ERAM WINDOW TEST OK 2 ERAM WP TEST OK EST18 ERAM STEP TEST EST19 ERAM HARD BREAK TEST1 1 UBC HARDBREAK TES 2 CHAO 7 HARDBREAK TES 3 CHBO 7 HARDBREAK TES 4 CHCO 7 HARDBREAK TES TEST20 ERAM HARD BREAK TEST2 1 SEQUENTIAL BREAK TES 2 RAR OVERFLOW BREAK TEST 3 CHC TIMEOUT BREAK TEST 4 CHBO INTERRUPT TES EST21 ERAM SOFT BREAK TEST EST22 COMPULSORY BREAK TEST EST23 ERAM TRACE TEST 1 SUBROUTINE TRACE TEST 001 001 001 001 001 001 001 COUNT OUNT COUNT COUNT COUNT 21 OK OK OK 001 001 001 001 001 001 001 OK OK OK Diagnostic Program Output Example E8000 EVCHIP Test cont 2 RANGE TRACE TEST 3 SUBROUTINE RANGE TRACE TEST 4 RACE STOP TEST 5 RACE SPECIAL CONDITION T 6 7 8 GI uv H RACE SUPPRESS TES
3. Some figures in this diagnostic program manual may show items different from your actual system Limited Anticipation of Danger Hitachi cannot anticipate every possible circumstance that might involve a potential hazard The warnings in this diagnostic program manual and on the emulator product are therefore not all inclusive Therefore you must use the emulator product safely at your own risk SAFETY PAGE READ FIRST e READ this user s manual before using this emulator product e KEEP the user s manual handy for future reference Do not attempt to use the emulator product until you fully understand its mechanism DEFINITION OF SIGNAL WORDS DANGER indicates an imminently hazardous situation which if not avoided will result in DEATH or SERIOUS INJURY to you or other people WARNING indicates a potentially hazardous situation which if not avoided could result in DEATH or SERIOUS INJURY to you or other people CAUTION indicates a hazardous situation which if not avoided may result in minor or moderate injury to you or other people or may result in damage to the machine or loss of the user program It may also be used to alert against unsafe usage NOTE emphasizes essential information ZN WARNING Observe the precautions listed below Failure to do so will result in a FIRE HAZARD and will damage the user system and the emulator product or will result in PERSONAL INJURY The USER PROGRAM will be LOST Caref
4. RS232C LOOP CONNECTOR EXIST Y N N P1284 LOOP CONNECTOR EXIST Y N N OPTION LAN BOARD EXIST Y N N bi H T START Y N Y TEST01 FLASH MEMORY READ TEST COUNT 001 1 MONITOR SUM CHECK OK 2 SYSTEM SUM CHECK OK 3 EVCHIP FIRM SUM CHECK OK 4 CONFIG SUM CHECK OK 5 T M SUM CHECK OK 6 LAN SUM CHECK NO LAN FILE 7 ITRON SUM CHECK NO TRON FILE TESTO2 CONT WORK RAM TEST COUNT 001 1 PAUSE TES 2 MARCHING TEST OK TESTO3 SHARED RAM TEST COUNT lt 001 1 PAUSE TES OK 2 MARCHING TEST OK TESTO4 FIRM RAM TEST COUNT lt 001 1 PAUSE TES OK 2 MARCHING TES OK TESTO5 OPTION I F TEST COUNT lt 001 1 DPRAM PAUSE TES OK 2 DPRAM MARCHING TEST OK 20 Diagnostic Program Output Example E8000 EVCHIP Test cont
5. hereby under any patents copyrights or other intellectual property rights of Renesas Electronics or others You should not alter modify copy or otherwise misappropriate any Renesas Electronics product whether in whole or in part Descriptions of circuits software and other related information in this document are provided only to illustrate the operation of semiconductor products and application examples You are fully responsible for the incorporation of these circuits software and information in the design of your equipment Renesas Electronics assumes no responsibility for any losses incurred by you or third parties arising from the use of these circuits software or information When exporting the products or technology described in this document you should comply with the applicable export control laws and regulations and follow the procedures required by such laws and regulations You should not use Renesas Electronics products or the technology described in this document for any purpose relating to military applications or use by the military including but not limited to the development of weapons of mass destruction Renesas Electronics products and technology may not be used for or incorporated into any products or systems whose manufacture use or sale is prohibited under any applicable domestic or foreign laws or regulations Renesas Electronics has used reasonable care in preparing the information included in this document but Re
6. on the personal computer After the host interface software IPW is initiated the E8000 emulator executes a self diagnostic test which checks the internal RAM and the registers while displaying the starting message shown on the following page For details refer to section 5 Troubleshooting in the SH7612 E8000 Emulator User s Manual HS7612EDD81HE 14 E8000 Emulator Starting Message EMULATOR INTERFACE HS8000EIW01SF Vn m Copyright C Hitachi Ltd 1996 Licensed Material of Hitachi Ltd E8000 MONITOR HS8000ESTO2SR Vn m Copyright C Hitachi Ltd 1995 Licensed Material of Hitachi Ltd TESTING RAM 0123 START E8000 S START E8000 F FLASH MEMORY TOOL L SET LAN PARAMETER T START DIAGNOSTIC TEST S F L T Notes 1 Underlined sections should be entered by the user Both uppercase and lowercase letters are acceptable 2 RET RETURN key 4 Load the diagnostic program according to the following procedure Loading Diagnostic Program START E8000 S START E8000 F FLASH MEMORY TOOL L SET LAN PARAMETER T START DIAGNOSTIC T S F L T t RI E uN poi DEJ H E8000 EMULATOR TEST 4 MAINTENANCE PROGRAM DIAG SYS Version No x xx mm da y y y y Copyright C Hitachi Ltd 1998 5 Specify the test condition When the diagnostic program is loaded and
7. the following message is displayed on the personal computer select the desired test conditions 15 Test Condition Specifications Please key in TEST PARAMETER OPERATION TEST EXECUTE Y N N_ RET a ERROR CONTINUE Y N N_ RET b TEST MODE SELECT 1 E8000 ONLY 2 E8000 EVCHIP 3 E8000 EVCHIP FIXED USER TEST MODE 1 2 3 2 RET c DEVICE TYPE SH7612 RS232C LOOP CONNECTOR EXIST Y N N_ RET d P1284 LOOP CONNECTOR EXIST Y N N_ RET e OPTION LAN BOARD EXIST Y N N_ RET f START Y N Y RET g Description a Only for tests requiring operator intervention Enter Y to execute the operation tests b c d e 8 6 Otherwise enter N Y Test continues when an error occurs N Test stops when an error occurs 1 Independent E8000 emulator system test 2 E8000 emulator device control board and EV chip board test 3 E8000 emulator system test at shipment cannot be used Enter Y to execute the serial interface test Otherwise enter N Enter Y to execute the bidirectional parallel interface test Otherwise enter N Enter Y to execute the optional LAN board test Otherwise enter N The test starts by entering Y If N is entered the diagnostic program main title will be displayed again Execute the diagnostic program using t
8. www renesas co Cautions Hitachi neither warrants nor grants licenses of any rights of Hitachi s or any third party s patent copyright trademark or other intellectual property rights for information contained in this document Hitachi bears no responsibility for problems that may arise with third party s rights including intellectual property rights in connection with use of the information contained in this document Products and product specifications may be subject to change without notice Confirm that you have received the latest product standards or specifications before final design purchase or use Hitachi makes every attempt to ensure that its products are of high quality and reliability However contact Hitachi s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury such as aerospace aeronautics nuclear power combustion control transportation traffic safety equipment or medical equipment for life support Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating operating supply voltage range heat radiation characteristics installation conditions and other characteristics Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges Even within the guarantee
9. 4 interface test is specified TESTOS is executed when the serial interface test is specified TEST12 is executed when the operation tests are specified TEST16 to TEST25 are not executed when the E8000 ONLY test is selected 3 4 Data Output to the Printer The following describes the process for sending diagnostic program execution results to the printer using the ES000 emulator Diagnostic Program Output to Printer START E8000 S START E8000 F FLASH MEMORY TOOL L SET LAN PARAMETER T START DIAGNOSTIC TEST S F L T gt a TM LOG RET a S F L T t RET b Diagnostic program execution CTRL C c gt g RET d E8000 MONITOR HS8000ESTO2SR Vn m Copyright C Hitachi Ltd 1995 Licensed Material of Hitachi Ltd TESTING RAM 0123 START E8000 START E8000 FLASH MEMORY TOOL SET LAN PARAMETER START DIAGNOSTIC TEST S F L T gt RET e EA GE Fay o Notes 1 Underlined sections should be entered by the user 2 RET RETURN key Description a b c d e Enter the following command after the emulator monitor command prompt gt a TM LOG RET In the above example a indicates drive a and TM LOG indicates the file name Note When selecting drive a insert the floppy disk in the floppy disk drive before executing this command Execute the diagnostic program Press t
10. EBUGGER FILE OK Y N N_ RET ITRON debugger 12 Operations 11 Enter Y RET to allow the diagnostic program file DIAG SYS to be loaded Then enter the parallel transfer command to load DIAG SYS in the current directory on the PC to the emulator flash memory 12 Enter DIR RET to check whether the necessary files have been loaded 13 Enter O RET to terminate the flash FM gt Q RET memory management tool 14 Installation is completed Display Message LOAD DIAGNOSTIC FILE INPUT COMMAND COMPLETED FM gt DIR RET lt FILE ID gt lt STATUS gt SYS OK CONF OK LAN NO FIRM OK TRON NO DIAG OK INI OK MON OK START E8000 S START E8000 F FLASH MEMORY TOOL L SET LAN PARAMETER T START DIAGNOSTIC S F L T 13 OK EST Y N F Y RE B A DIAG SYS RET 4 2 Operation Procedure 1 Correctly connect the following components e E8000 emulator and personal computer RS232C interface e E8000 emulator and EV chip board when the E8000 EVCHIP test is selected For other components check connection according to the user system configuration Remove the EV chip board from the user system Turn on the following power supplies e Personal computer e E8000 emulator For other components supply an appropriate voltage according to the user system configuration Start up the host interface software IPW
11. I State Law Some states do not allow the exclusion or limitation of implied warranties or liability for incidental or consequential damages so the above limitation or exclusion may not apply to you This warranty gives you specific legal rights and you may have other rights which may vary from state to state The Warranty is Void in the Following Cases Hitachi shall have no liability or legal responsibility for any problems caused by misuse abuse misapplication neglect improper handling installation repair or modifications of the emulator product without Hitachi s prior written consent or any problems caused by the user system All Rights Reserved This diagnostic program manual and emulator product are copyrighted and all rights are reserved by Hitachi No part of this diagnostic program manual all or part may be reproduced or duplicated in any form in hard copy or machine readable form by any means available without Hitachi s prior written consent Other Important Things to Keep in Mind 1 Circuitry and other examples described herein are meant merely to indicate the characteristics and performance of Hitachi s semiconductor products Hitachi assumes no responsibility for any intellectual property claims or other problems that may result from applications based on the examples described herein 2 No license is granted by implication or otherwise under any patents or other rights of any third party or Hitachi Figures
12. LAN when performing the LAN board optional test 3 2 Test Items Test items are listed in table 3 1 The test items to be executed depend on the test system configuration Table 3 1 Diagnostic Program Test Items No TESTO1 TESTO2 TESTO3 TESTO4 TESTO5 TESTO6 TESTO7 TESTO8 TESTO9 TEST10 TEST11 TEST12 TEST13 TEST14 TEST15 TEST16 TEST17 TEST18 TEST19 TEST20 TEST21 TEST22 TEST23 TEST24 TEST25 Notes O Xx Test Item FLASH MEMORY READ TEST CONT WORK RAM TEST SHARED RAM TEST FIRM RAM TEST OPTION I F TEST LAN I F TEST P1284 I F TEST SERIAL I F TEST JTAG TEST CONT REG TEST IDR READ DIP SWITCH TEST TRACE REG TEST TRACE RAM TEST PARALLEL RAM TEST EBOX TEST ERAM WINDOW TEST ERAM STEP TEST ERAM HARD BREAK TEST1 ERAM HARD BREAK TEST2 ERAM SOFT BREAK TEST COMPULSORY BREAK TEST ERAM TRACE TEST ERAM TIME MEASURE TEST ERAM PARALLEL MONITOR TEST Description Control board flash memory test Control board work RAM test Trace board RAM test Firmware RAM test Optional host computer I F DPRAM test LAN board interface test Bidirectional parallel interface test Serial interface test JTAG controller test Control board register test E8000 hardware configuration check Control board DIP switch test Trace board register test Trace board RAM test Parallel RAM test DCONT firmware and ID check ERAM read write test ERAM step test ERAM hardware break test ERAM hardware break test E
13. RAM software break test CBR register break test ERAM trace mode test Time measurement function check ERAM parallel monitor test Executed without operator intervention Executed when specified Not executed Executed or Not E8000 ONLY O O OJOJO ojo X x x x x x x x x x O0jpoOojJO E8000 EVCHIP O O O O O ojo O OJ OJOJ OJOJ OJ OJOJOJOJOJO Note If an error occurs and ERROR CONTINUE is not specified displays an error message stops test execution and displays the following message Retry Y N If Y is entered retests the test item wherein the error occurred If N is entered displays the following message Continue Y N If Y is entered quits testing the test item wherein the error occurred and goes on to the next test item If N is entered displays the following message Abort Y N If Y is entered resets the system software If N is entered returns to the first message Retry Y N and repeats the above procedure until Y is entered 3 3 Operation Flowchart Figure 3 1 shows the diagnostic program operation flowchart Load diagnostic progam Eso00 emulator cry Es000 EWCHIP FIXED USER E8000 ONLY or ESOOO EVCHIPS The user cannot perform this test Specify test conadtiorg Initiate diagnostic progra m Figure 3 1 Diagnostic Program Operation Flowchart Note TESTO06 is executed when the optional LAN board test is specified TEST07 is executed when the P128
14. Serial Interface Connector Figure 6 3 shows pin locations in the serial interface connector on the E8000 emulator Table 6 1 lists the signal name of each pin SERIAL Figure 6 3 Pin Locations in ES000 Emulator Serial Interface Connector Table 6 1 Pin Signal Names in E8000 Emulator Serial Interface Connector Pin No Signal Name Pin No Signal Name 1 and 9 NC 5 GND 2 RXD 6 DSR 3 TXD 7 RTS 4 DTR 8 CTS 25 6 4 Bidirectional Parallel Interface Connector Figure 6 4 shows pin locations in the bidirectional parallel interface connector on the E8000 emulator Table 6 2 lists the signal name of each pin PARALLEL 1217161514412 121110 S 27165342321 E A EE er Ped E is Figure 6 4 Pin Locations in E8000 Emulator Bidirectional Parallel Interface Connector Table 6 2 Pin Signal Names in E8000 Emulator Bidirectional Parallel Interface Connector Pin No Signal Name Pin No Signal Name 1 BUSY P 11 SD5 P 2 SELECT P 12 SD6 P 3 ACK N 13 SD7 P 4 FAULT N 14 INIT N 5 PERROR P 15 STROBE N 6 SDO P 16 SELECTIN N 7 SD1 P 17 AUTOFD N 8 SD2 P 18 HOSTLOGICHIGH 9 SD3 P 36 PERIPHERALLOGICHIGH 10 SD4 P 19 to 35 GND 26 E
15. T INRAM TRACE TES 8 ERAM CONTINOUS ACCESS TEST TEST24 ERAM TIME MEASURE T 1 SUBROUTINE TIME MEASURE TEST1 2 SUBROUTINE TIME MEASURE TEST2 3 SUBROUTINE TIME MEASURE TEST3 4 TIME STUMP TEST 5 A to B TIME MEASURE TEST TEST25 ERAM PARALLEL MONITOR TEST TESTO1 FLASH MEMORY READ TEST a b 1 MONITOR SUM CHECK OK d Description a Test item number b Test item c Execution count d Test result OPO Ov OO O N A A NN AW OK OK OK OK OK OK EST COUNT 001 COUNT 001 COUNT 002 22 c OK Section 5 Error Handling If an error occurs provide a Hitachi sales agency with a detailed description of the problem 23 Section 6 Testing Circuits and Connectors 6 1 Testing Circuit for P1284 I F TEST TESTO07 Connect the testing circuit that forms the loop in figure 6 1 to the bidirectional parallel interface connector on the ES000 emulator BL SY P SUTOFD H SELECT P SELEC TIM ACK H STROBE H PERROR P IMIT N Figure 6 1 Testing Circuit for P1284 Loop Back Test 6 2 Testing Circuit for SERIAL I F TEST TEST08 Connect the testing circuit in figure 6 2 to the serial interface connector on the E8000 emulator Personal computer MZ Figure 6 2 Testing Circuit for SERIAL I F Test 24 6 3
16. To our customers Old Company Name in Catalogs and Other Documents On April 1 2010 NEC Electronics Corporation merged with Renesas Technology Corporation and Renesas Electronics Corporation took over all the business of both companies Therefore although the old company name remains in this document it is a valid Renesas Electronics document We appreciate your understanding Renesas Electronics website http www renesas com April 1 2010 Renesas Electronics Corporation Issued by Renesas Electronics Corporation http www renesas com Send any inquiries to http www renesas com inquiry ENESAS 8 10 11 12 Notice All information included in this document is current as of the date this document is issued Such information however is subject to change without any prior notice Before purchasing or using any Renesas Electronics products listed herein please confirm the latest product information with a Renesas Electronics sales office Also please pay regular and careful attention to additional and different information to be disclosed by Renesas Electronics such as that disclosed through our website Renesas Electronics does not assume any liability for infringement of patents copyrights or other intellectual property rights of third parties by or arising from the use of Renesas Electronics products or technical information described in this document No license express implied or otherwise is granted
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18. allel interface cable P1284 Optional Personal computer DOS V machine Always necessary System floppy disk HS7612EDD81SF Always necessary Host interface software IPW included Printer Optional Personal computer DOS machine Bidirectional parallel Trace cables interface cable P1 284 f l coaxial cables EV chip board Figure 2 1 Test System Configuration Section 3 Diagnostic Program Function 3 1 General Description The diagnostic program has three test system configurations E8000 ONLY test and E8000 EVCHIP test which are independent E8000 emulator system tests and E8000 EVCHIP FIXED USER test Note that the E8000 EVCHIP FIXED USER test cannot be executed for it is the E8000 emulator system test at shipment and needs an additional system for testing CAUTION Before executing an independent E8000 emulator system test remove the EV CHIP BOARD from the USER SYSTEM Correct test results cannot be obtained when the E8000 emulator is still connected to the user system Independent E8000 Emulator System Test E8000 ONLY The system configuration shown in figure 2 1 is used for testing the independent E8000 emulator system The test results are displayed on the personal computer display After start up the system enters an endless test loop without operator intervention until an error is detected When an error occurs and ERROR CONTINUE is not specified the test is terminated If ERROR CONTINUE is speci
19. d ranges consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail safes so that the equipment incorporating Hitachi product does not cause bodily injury fire or other consequential damage due to operation of the Hitachi product This product is not designed to be radiation resistant No one is permitted to reproduce or duplicate in any form the whole or part of this document without written approval from Hitachi Contact Hitachi s sales office for any questions regarding this document or Hitachi semiconductor products IMPORTANT INFORMATION READ FIRST e READ this user s manual before using this emulator product e KEEP the user s manual handy for future reference Do not attempt to use the emulator product until you fully understand its mechanism Emulator Product Throughout this document the term emulator product shall be defined as the following products produced only by Hitachi Ltd excluding all subsidiary products e Emulator station e Device control board e EV chip board The user system or a host computer is not included in this definition Purpose of the Emulator Product This emulator product is a software and hardware development tool for systems employing the Hitachi microcomputer HD6417612 hereinafter referred to as SH7612 By exchanging the device control board and EV chip board this emulator product can also be used f
20. d to the host computer via the bidirectional parallel interface the diagnostic program can be loaded with the following procedure Note that the system disk is assumed to be inserted in drive A of the host computer It takes approximately one minute Operations Display Message 1 Initiate the E8000 system floppy disk IPW 2 Power on the E8000 emulator 3 Emulator monitor command prompt START E8000 S START E8000 F FLASH MEMORY TOOL L SET LAN PARAMETER T START DIAGNOSTIC TEST S F L T _ 4 Enter F RET to initiate the flash S F L T E RET memory management tool The FM gt emulator displays prompt FM gt and waits for a flash memory management tool command 5 Enter SL RET to load the system FM gt SL RET program 6 Enter 1 RET to select PC as the SELECT LOAD No 1 PC or 2 WS 1 RET host computer type and 2 RET to SELECT INTERFACE 1 RS 232C or 2 PARALLEL 2 select parallel interface as the RET interface method 7 Enter N RET to not load system LOAD E8000 SYSTEM FILE OK Y N N RET program E8000 SYS 8 Enter N RET to not load LOAD CONFIGURATION FILE OK Y N N RET configuration file SHCNF761 SYS 9 Enter N RET to not load firmware LOAD FIRMWARE FILE OK Y N N_ RET file SHDCT761 SYS 10 Enter N RET to not load the LOAD ITRON D
21. fied the test resumes execution after an error content display When initiating the diagnostic program select whether to execute the following tests e Operation tests e Serial interface test P1284 interface test LAN board optional test Test of E8000 Emulator SH7612 Device Control Board and SH7612 EV Chip Board E8000 EVCHIP The system configuration shown in figure 2 1 is used for testing the E8000 emulator and the SH7612 device control board and SH7612 EV chip board for the E8000 emulator The test results are displayed on the personal computer display After start up the system enters an endless test loop without operator intervention until an error is detected When an error occurs and ERROR CONTINUE is not specified the test is terminated If ERROR CONTINUE is specified the test resumes execution after an error content display When initiating the diagnostic program select whether to execute the following tests e Operation tests e Serial interface test e P1284 interface test LAN board optional test Notes 1 When all test items are executed once press the CTRL C keys and interrupt the test 2 The P1284 interface and serial interface tests require additional circuits Prepare the necessary circuits according to the diagrams in section 6 Testing Circuits and Connectors before selecting the P1284 interface and serial interface tests 3 The LAN board must be installed in the E8000 station and connected to
22. gnostic program is on a 3 5 inch floppy disk HS7612EDD81SF When an error occurs execute the diagnostic program according to section 4 Diagnostic Program Operation Procedure Notes 1 This diagnostic program is not capable of finding all failures possible to occur in the E8000 emulator If execution results of the diagnostic program indicate a failure in the E8000 emulator inform a Hitachi sales agency of the test results in detail Hitachi makes no warranties for an E8000 emulator that has been taken apart repaired or remodeled by the user based on the test results of the diagnostic program In addition to this diagnostic program run the emulator internal system test described in section 5 Troubleshooting in the SH7612 E8000 Emulator User s Manual HS7612EDD81HE Section 2 Configuration 2 1 Test System Configuration Components required for diagnostic program execution are shown in table 2 1 and the test system configuration is shown in figure 2 1 Table 2 1 Test System Components Components Remarks E8000 emulator HS8000EST02H Control board Always necessary HS8000PWB81H Device control board Always necessary HS7612EDD81H Trace board Always necessary HS8000PWB82H PC I F board Always necessary HS8000PWB85H LAN board HS7000ELNO1H or HS7000ELNO2H Depends on user system configuration EV chip board HS7612EBH81H or HS7612EBK81H Always necessary Serial interface cable RS232C Always necessary Bidirectional par
23. he CTRL C keys after executing the diagnostic program Enter the following command to return to the monitor command input wait state gt q RET Enter the following command in the monitor command input wait state to terminate data output to the file gt RET Printing Open the file TM LOG to which the diagnostic program execution results were output and output the data to a printer from the personal computer used The file can be opened from the existing editor of the personal computer used 10 Section 4 Procedures This section describes the diagnostic program operation procedure iaa Always switch OFF all devices before connecting or disconnecting the E8000 EMULATOR and OTHER DEVICES Failure to do so will result in a FIRE HAZARD and will damage the E8000 emulator and other devices or will result in PERSONAL INJURY Notes 1 To execute the diagnostic program DIAG SYS must be installed in flash memory according to the instructions in the SH7612 E8000 Emulator User s Manual HS7612EDD81HE 2 Before executing the diagnostic program make sure the DIP switches have the same settings as at shipment refer to figure 4 1 3 When using the PCIF interface execute the diagnostic program from HDI Swa Figure 4 1 DIP Switch Setting at Shipment 11 4 1 Installation Procedure To execute the diagnostic program file DIAG SYS must be installed in the ES000 emulator flash memory If the E8000 emulator is connecte
24. he procedure shown in figure 3 1 Execute each test item following the diagnostic program specifications OK is displayed if a test is executed with no errors An example of the E8000 EVCHIP test is shown on pages 18 to 20 16 7 For executing the bidirectional parallel interface test TESTO7 To execute the bidirectional parallel interface test install the P1284 loop connector described in section 6 1 Testing Circuit for P1284 I F Test TESTO7 onto the bidirectional parallel interface connector on the E8000 emulator before executing the diagnostic program Perform the following operations while executing the bidirectional parallel interface test Operation Procedures for TEST07 P1284 I F TEST 1 Before executing the diagnostic program install the P1284 loop connector as shown in figure 4 2 2 Enter Y to the following message at diagnostic program initiation P1284 LOOP CONNECTOR EXIST Y N Y RET 3 When the diagnostic program is executed the bidirectional parallel interface test will be executed without operator interventions If no error occurs the following messages are displayed TESTO7 P1284 I F TEST COUNT 001 FIFO R W TEST OK PARALLEL INTERRUPT TEST OK For executing the serial interface test TESTO8 To execute the serial interface test install the RS232C loop connector described in section 6 2 Testing Circuit for SERIAL I F Test TESTO8 onto the serial in
25. in accordance with published specifications and free from defects in material and or workmanship Hitachi at its option will repair or replace any emulator products returned intact to the factory transportation charges prepaid which Hitachi upon inspection shall determine to be defective in material and or workmanship The foregoing shall constitute the sole remedy for any breach of Hitachi s warranty See the Hitachi warranty booklet for details on the warranty period This warranty extends only to you the original Purchaser It is not transferable to anyone who subsequently purchases the emulator product from you Hitachi is not liable for any claim made by a third party or made by you for a third party DISCLAIMER HITACHI MAKES NO WARRANTIES EITHER EXPRESS OR IMPLIED ORAL OR WRITTEN EXCEPT AS PROVIDED HEREIN INCLUDING WITHOUT LIMITATION THEREOF WARRANTIES AS TO MARKETABILITY MERCHANTABILITY FITNESS FOR ANY PARTICULAR PURPOSE OR USE OR AGAINST INFRINGEMENT OF ANY PATENT IN NO EVENT SHALL HITACHI BE LIABLE FOR ANY DIRECT INCIDENTAL OR CONSEQUENTIAL DAMAGES OF ANY NATURE OR LOSSES OR EXPENSES RESULTING FROM ANY DEFECTIVE EMULATOR PRODUCT THE USE OF ANY EMULATOR PRODUCT OR ITS DOCUMENTATION EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGES EXCEPT AS EXPRESSLY STATED OTHERWISE IN THIS WARRANTY THIS EMULATOR PRODUCT IS SOLD AS IS AND YOU MUST ASSUME ALL RISK FOR THE USE AND RESULTS OBTAINED FROM THE EMULATOR PRODUCT T
26. nesas Electronics does not warrant that such information is error free Renesas Electronics assumes no liability whatsoever for any damages incurred by you resulting from errors in or omissions from the information included herein Renesas Electronics products are classified according to the following three quality grades Standard High Quality and Specific The recommended applications for each Renesas Electronics product depends on the product s quality grade as indicated below You must check the quality grade of each Renesas Electronics product before using it in a particular application You may not use any Renesas Electronics product for any application categorized as Specific without the prior written consent of Renesas Electronics Further you may not use any Renesas Electronics product for any application for which it is not intended without the prior written consent of Renesas Electronics Renesas Electronics shall not be in any way liable for any damages or losses incurred by you or third parties arising from the use of any Renesas Electronics product for an application categorized as Specific or for which the product is not intended where you have failed to obtain the prior written consent of Renesas Electronics The quality grade of each Renesas Electronics product is Standard unless otherwise expressly specified in a Renesas Electronics data sheets or data books etc Standard Computers office eq
27. or systems using Hitachi microcomputers supported by other E8000 series emulators This emulator product must only be used for the above purpose Limited Applications This emulator product is not authorized for use in MEDICAL atomic energy aeronautical or space technology applications without consent of the appropriate officer of a Hitachi sales company Such use includes but is not limited to use in life support systems Buyers of this emulator product must notify the relevant Hitachi sales offices before planning to use the product in such applications Improvement Policy Hitachi Ltd including its subsidiaries hereafter collectively referred to as Hitachi pursues a policy of continuing improvement in design performance and safety of the emulator product Hitachi reserves the right to change wholly or partially the specifications design user s manual diagnostic program manual and other documentation at any time without notice Target User of the Emulator Product This emulator product should only be used by those who have carefully read and thoroughly understood the information and restrictions contained in the user s manual Do not attempt to use the emulator product until you fully understand its mechanism It is highly recommended that first time users be instructed by users that are well versed in the operation of the emulator product I LIMITED WARRANTY Hitachi warrants its emulator products to be manufactured
28. ress on the user interface Vil Preface Thank you for purchasing the E8000 emulator for Hitachi s original microcomputer SH7612 The diagnostic program automatically checks whether the E8000 emulator is operating correctly Read this manual and understand it before using the diagnostic program Contents SEA OVER VIC Whereas chats Ale ele Sa Rites ae aed oak 1 Mile PU A A E amidase Suet Rosenman ea 1 Section 2 Comfeurallon doo ence 2 21 Test System Confira OR ss dan ia ie A Dua ek ages teen el eee 2 Section 3 Diagnostic Program Function ane 4 3 General Description nissene iiaa atando iaa A ERE asat 4 o o a A A E A E E Pe O ROE OO A REE 6 SO MOWCH At zuni ni pa ee aa ga pa ee ete jaka S o evi 8 3 4 Data DU iS 9 Section PrOPEdUTES aaa arto aia 11 4 1 Installation Procedure ona od lnea 12 4 2 Operation Procedure ae e do aie 14 Sections NN A ab re E tae 23 Section 6 Testing Circuits and ConnectofS ane 24 6 1 Testing Circuit for P1284 I F TEST TEST 07 cccscesscssesssscessesssseesceecceesencssesnsessensosees 24 6 2 Testing Circuit for SERIAL I F TEST TEST 08 0 cccssscssssscssssssscneccsensccssnsccesneceesneesees 24 0 3 Serial Interface Comedor ie top 25 6 4 Bidirectional Parallel Interface ConeclO sostini 26 Section 1 Overview 1 1 Purpose This diagnostic program is used to automatically troubleshoot and maintain an SH7612 E8000 emulator hardware system The dia
29. s products or if you have any other inquiries Note 1 Renesas Electronics as used in this document means Renesas Electronics Corporation and also includes its majority owned subsidiaries Note 2 Renesas Electronics product s means any product developed or manufactured by or for Renesas Electronics To all our customers Regarding the change of names mentioned in the document such as Hitachi Electric and Hitachi XX to Renesas Technology Corp The semiconductor operations of Mitsubishi Electric and Hitachi were transferred to Renesas Technology Corporation on April 1st 2003 These operations include microcomputer logic analog and discrete devices and memory chips other than DRAMs flash memory SRAMs etc Accordingly although Hitachi Hitachi Ltd Hitachi Semiconductors and other Hitachi brand names are mentioned in the document these names have in fact all been changed to Renesas Technology Corp Thank you for your understanding Except for our corporate trademark logo and corporate statement no changes whatsoever have been made to the contents of the document and these changes do not constitute any alteration to the contents of the document itself Renesas Technology Home Page http www renesas com Renesas Technology Corp Customer Support Dept April 1 2003 ENESAS Renesas Technology Corp ENESAS C 7 D me 7 lt D D E8000 SH7612 Emulator Diagnostic Program Manual
30. terface connector on the E8000 emulator before executing the diagnostic program Perform the following operations while executing the serial interface test Operation Procedures for TEST08 SERIAL I F TEST 1 Before executing the diagnostic program install the RS232C loop connector as shown in figure 4 2 2 Enter Y to the following message at diagnostic program initiation RS232C LOOP CONNECTOR EXIST Y N Y RET 3 When the diagnostic program is executed the serial interface test will be executed without operator interventions If no error occurs the following message is displayed TESTO8 SERIAL I F TEST COUNT 001 OK 17 Pi zsd loop connector Must be connected tothe bidirectional parallel interface connector onthe E2000 station for TESTO Serial interface e cable Personal computer DOS machine Resa loop connector Must be connected tothe serial interface connector onthe Esooo station for TESTES Es000 station Figure 4 2 Loop Connector Installation 9 For executing the operation tests TEST12 To execute the operation tests operator interventions are required during diagnostic program execution Perform the following operations while executing the operation tests Operation Procedures for TEST12 DIP SWITCH TEST 1 2 3 4 5 6 Enter Y to the following message at diagnostic program initiation OPERATION TEST EXECUTE Y N Y RET
31. uipment communications equipment test and measurement equipment audio and visual equipment home electronic appliances machine tools personal electronic equipment and industrial robots High Quality Transportation equipment automobiles trains ships etc traffic control systems anti disaster systems anti crime systems safety equipment and medical equipment not specifically designed for life support Specific Aircraft aerospace equipment submersible repeaters nuclear reactor control systems medical equipment or systems for life support e g artificial life support devices or systems surgical implantations or healthcare intervention e g excision etc and any other applications or purposes that pose a direct threat to human life You should use the Renesas Electronics products described in this document within the range specified by Renesas Electronics especially with respect to the maximum rating operating supply voltage range movement power voltage range heat radiation characteristics installation and other product characteristics Renesas Electronics shall have no liability for malfunctions or damages arising out of the use of Renesas Electronics products beyond such specified ranges Although Renesas Electronics endeavors to improve the quality and reliability of its products semiconductor products have specific characteristics such as the occurrence of failure at a certain rate and malfunctions under cert
32. ully handle the emulator product to prevent receiving an electric shock because the emulator product has a DC power supply Do not repair or remodel the emulator product by yourself for electric shock prevention and quality assurance 2 Always switch OFF the emulator product and the user system before connecting or disconnecting any CABLES or PARTS 3 Always before connecting make sure the connection direction is correct Supply power according to the power specifications and do not apply an incorrect power voltage Use only the provided AC power cable Use only the specified type of fuse VI Warnings on Emulator Usage Warnings described below apply as long as you use this emulator Be sure to read and understand the warnings below before using this emulator Note that these are the main warnings not the complete list AN WARNING Always switch OFF the emulator and user system before connecting or disconnecting any CABLES or PARTS Failure to do so will result in a FIRE HAZARD and will damage the user system and the emulator product or will result in PERSONAL INJURY The USER PROGRAM will be LOST ZN WARNING Place the emulator station and EV chip board so that the trace cables are not bent or twisted A bent or twisted cable will impose stress on the user interface leading to connection or contact failure Make sure that the emulator station is placed in a secure position so that it does not move during use nor impose st

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