SP 3000 SP 3000 1333 / 1066 / 800 MHz
Contents
1. Mar C chk CS Jchk_CKE chk DOM Toggle lt gt OK spdRC spaddr Toggle lt gt OK Toggle Toggle the check box x or T x enabled disabled OK Move the cursor to next menu item Loop Test Loop Configuration Range between 1 and 999 CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 25 Test Loop 001 Ese Toggle lt gt OK Toggle key and increment by 1 gt Toggle key and increment by 1 Setting Test Loop to 000 will set the tester into a continuous burn in loop 3 4 7 Set File Name Menu Allow the user to alter the name of the file Range of Characters 0 to 9 and A to Z File Name DEMO Jf Jt gt J OK Hold down and increment the character gt Rotate the underline cursor to next position 3 4 8 Stop On Error Menu Default is STOP_ON_ERROR enabled so that during testing first error encounter will stop the test immediately and print the result 3 5 Test Menu This menu is assigned as the Auto ID or File Menu When the user presses the Test Key The SP3000 will perform an ICC current measurement check before starting test and the display message will be as follows L001 ICC Current 00 01 Cancel Elapsed Time l L001 Walk Address 00 05 Cancel If no modules are present on the SP3000 Test socket2. 3 3 File Menu For verifying a Known memory module the following menu should be selected The following display contains only 2 standard device with predefined BASIC test The SP3000 tester allows up to a limited 8 customized test parameters to be saved For more storage device file selection the SP3000 Advanced PC software offers more device selection Please check with CST customer support for a copy of the PC software Std Dev 2 User Saved Dev 0 Ese Std User JI After Std or User key is pressed 1 gt DDR3 128M x 64 1024MB 2B 8 2x533Mz Esc Edit Next Test For Edit function refer to section 3 4 Edit Menu Press Next function scroll to Next device file For Test function refer to section 3 4 Test Menu Press Esc key return to Main Men 3 4 Edit Menu This menu allows users to modify the test parameters and test patterns There are two buttons that are use throughout the Edit Menu Scroll the extreme right button allows for page scroll to next screen which show more parameters Esc the left button when depressed returns back to previous menu Edit Menu 1 DDR3 128Mx64 1024MB 1B 8 2x533Mz Esc AdrDat BnkCtl Pattn Scroll CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 19 AdrDat to edit Address Data Paramters BnkCti to edit Bank Control Parameters Pattn to edit Test Pattern Preheat Loop Pa
3. Yes No Abort Saving CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 28 3 7 2 Delete File This menu is accessible from the user saved file menu Option Del When Auto ID a new device and pressing ESC to save the device and the maximum device is exceeded then the tester will automatically prompt you the following menu 5 gt DDR3 128Mx64 1GB 1B 4 2x533Mhz 1 5V Done Delete Next Done exit the delete menu Delete Delete the current selected file Confirm to delete file No Yes No Abort Delete Yes Confirm Delete Next Advance to next file CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 4 Quick Testing Guide with Examples his chapter will guide you through a simple example with a known DDR3 DIMM module to help you get familiar with the SP3000 DDR3 functions If you should have any doubt on the menu options please refer back to the previous chapter on operations basics for a detailed explanation The examples illustrated in this section use a standard 240pin 128Mb x 64 DDR3 DIMM memory module The device attributes are as follows e Voltage 1 5V e Row x Col 14x 10 1 bank e Data Bit x External Bank x Internal Bank 64x1 8 4 1 Auto ID an Unknown Device No SPD Programming Assume device type is unknown in this example 128Mx64 is used an Auto ID function is carried out to determine the memory devi
4. the tester will prompt an failure message on the display screen and it is as follows Fail wk_addr 2x 533Mhz L1 00 01 Ese Il lE Test During the testing any errors detected during testing will be aborted immediately and the FAIL message will be displayed Otherwise if no errors are detected upon completion of the defined tests a PASS message will be displayed CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 26 3 6 Result Menu After completing all the defined tests with no errors detected the LCD will display as follow PASS 2x533 Mhz L001 00 08 Esc Result Print View Test 4 Print Print Pass Results Test Test Function Esc Return Previous Menu If an error is detected the tester will display the following message FAIL Walk_Data L1 00 08 Esc Result Print View Test Print Print Error Results View View the Error Details Esc Return Previous Menu 3 6 1 View Error Details A When module Failed any test parameter the following results will be displayed and view function is selected B If the LCD cannot fully display all the failure bits on one screen or multiple banks have errors the More key will appear for more data to be displayed by pressing this key 21 2 3 4 5 6 7 8 17 19 35 39 49 51 56 58 68 Bank 1 More The final screen dis
5. WR 7 T RCD 7 TRP 7 setting This setting is programmed into the DIMM SPD e CL Read Latency can be preset to 5 6 800 7 8 1066Mhz 7 8 9 1333Mhz e WR Write Recovery Precharge can be change from 5 6 7 8 Changing the WR setting does not affect test time e Tred is the time delay between the Row and column address you can select either 5 6 7 8 9 Clock e Trp is the Auto Pre charge time DDR3 SDRAM internally generates the timing to satisfy Tras for the programmed burst length and CAS latency you can select either 5 6 7 8 9 Clock For MRSI1 Setting Extended Mode Register 1 Set ODT 40 ohm Output DIC 34 ohm JE ODT DIC J OK The MRS1 setting offer in the SP3000 DDR3 tester are for advanced users Always used the default value e ODT stands for On Die Termination is a feature that allows a DRAM to turn on off termination resistance for each DQ DQS RDQS and DM Signal via the ODT control The ODT feature is designed to improve signal integrity of the memory channel by allowing the DRAM controller to independently turn on off termination resistance for any or all dram devices In the SP3000 user can select 20 30 40 60ohm or 120ohm or disable the termination resistor e Output D I C Driver Impedance Control user can select 34 40 ohm For MRS2 Setting Extended Mode Register 1 Set DODT Off CAS WL 5 Refresh DODT _ Cas_WL Refresh DODT Dynamic ODT Control user can
6. to view the individual pass fail test result Step 6 Press Print to print a copy of the individual test result Step 6 Press Esc twice to return to the main menu Before reaching the main menu the tester will prompt you to save the new device detected Do you want to save this file Cancel F Name No Yes Step 7 Press No and return to main menu Step 8 End of example CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 31 4 2 Testing a Known Device with Stored File No Programming SPD To perform a test on a known standard device Step 1 Step 2 Step 3 Step 4 Step 5 Step 6 Step 7 Ifaprinter is connected press Print to print the error results Step 8 Step 9 Insert the known device in the test socket Select File Menu CST Inc SP3000 DDR3 1333 Mhz Rev 3 20 87 File Config SPD AutoID A next menu will prompt you to select Std Device or User Saved Device Std Dev 1 User Saved Dev 5 Main Std User Choose User for the standard device file Use Next to scroll to the next Device 1 DDR3 128Mx 64 1GB 1B 8 2x533Mhz 1 5V Esc Edit 1 Next Test Press Test to start the testing If module under test fails the LCD will display FAIL Walk data 2x533Mhz L001 00 03 Ese Result Print View Test Press View to see the error in
7. 125 these locations are used for programming manufacturing serial number and date code information WRT Page Length 4 Ese Il lt IT gt JI SPD Read 000 gt 255 Esc Toggle lt gt OK Mask Out Byte 120 125 Yes Ese Il I No OK e The Read Cmp allow user to Read amp Compare SPD data of the module under test with the SPD content that was saved in the buffer No SPD rewrite is possible for this mode selection The Write Cmp allow user to Write amp Compare SPD data of that from the tester buffer to the module under test CRC Checksum is automatically calculated at Byte 126 127 SPD_Data Test Allowed RD_Cmp Ese Il lt N OK SPD_Data Test Allowed WR Cmp Esc Toggle lt annee gt OK Step 5 Select OK and return back to the main menu CST Inc SP3000 DDR3 1333Mhz Rev 3 20 f6 File Config SPD AutoID Select SPD Read and this will prompt the tester to read the SPD content from the module inserted in test socket CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 37 Step 6 Step 7 Step 8 Step 9 Step 10 SPD Sub menu 000 00 01 02 03 04 05 06 07 08 09 OA OB Scroll Save Config Read OK Select Save and this will prompt the tester to read the SPD content into the tester buffer Note Only one set of SPD data can be saved at a
8. once the Auto I D function is activated the Module Type menu and the Clock Frequency menu will display allowing User to select the desired Data Rate Frequency of 800 1066 or 1333 MHz to test the module The tester will sense if the EEPROM has SPD data written this menu selection will appear Select Data Rate 800 1066 1333 3 2 2 Once the 1066 MHz Data rate frequency is selected it takes about 3 6 seconds to identify the SODIMM module depending on device type and configuration 00 03 3 2 3 If a known good module is detected the SP3000 LCD will display the following parameters DDR3 64Mx64 512MB 1B 8 2x533Mhz 1 5V Ese Edit Defset Test Press Edit key bring up the Edit Menu Press Test key bring up the Test Menu Press Esc key return to Main Menu Press Defset key to reset all test pattern to factory default value Walk Data Walk address Mat S CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 18 3 2 4 If a defective bad module is detected an error message will be prompted Occasionally this can be due to bad contacts of modules with the test sockets If this happens remove and re insert the DIMM module firmly and press the Auto ID to retest again EDO FPM standard DRAM or SDRAM module will not fit into the DDR3 Adapter the Cannot Identify Device will be prompted as shown below Cannot Identify Device Ese JE I Auto ID
9. select off 60 120 ohm CAS WL Write Latency user can select off 5 6 7 and 8 Clock Refresh Change the type of refresh 2 types of Refresh are used no refresh amp CAS before RAS CBR CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 24 Refresh Periods can be preset to 8 16 32 64 or 128 us per row e None No Refresh e CBR C A S Before R A S Refresh Period Change the Refresh Period Period us row 8 16 32 64 128 3 4 6 Pattn Test Pattern Preheat Loop Parameters Sub Menu The SP3000 utilizes the fast testing time approach to uncover any assembly errors and memory cell failures They are built with very fast tests time for high throughput and will provide over 99 5 confidence level on accuracy The user friendly selectable tests options are e Walk Data test w_data Walk Address test w_adar Mat S Marching March_C March_X March Y Moving Inversion Chip Select Test c s CKE Test CKE DQM Test DQM S P D Data Test SPDDAT S P D Address Test SPDADR When the Test Pattern is activated the following will be display Test adr dat mar Page L001 Esc Basic Custom Loop Basic a quick key to switch to default patterns and default to 1 test loop default test pattern to w_adr w_dat mar Custom User selectable test pattern x w_addr x w_data x Mat S Mat_X Toggle lt gt OK
10. testing needs of the computer service industry The compact portable and stand alone SP3000 with the proper optional adapters is capable of testing the standard DRAM page mode and EDO access mode 72 pin SIMM amp 168 pin SDRAM DIMM with optional adapter it has ability to test DDR2 DDR1 SODIMM amp PCMCIA type of modules and many All these tests are performed on the same base tester with optional plug and Test Adapter Designed with the service professionals in mind and coupled with the knowledge of the future memory market trends and demands the SP3000 is the Memory Testers with the future built in The automatic identification detection feature allows user to identify the module s configuration in seconds Special settings are not needed just insert the module and press a function key The results include memory size structure type and speed are clearly displayed on the LCD The testers can also provide a group of standard test devices for you to test with or if you prefer you can customize your test and save it in the tester so you won t lose the data even the tester is power down The SP3000 have been carefully planned and designed to be affordable while providing maximum upgrade ability for today and tomorrow s needs Their modular expansion adapter can accommodate future memory testing needs with ease at an affordable cost At the same time your investment in to the tester is protected from obsolescence The SP3000 is a cost e
11. 0 adapters are equipped with receptacle pins which enable the test socket to interface with the adapter without any soldering required Aligned test socket pins over the receptacle pins carefully and slowly push down the test sockets into the receptacles Be very careful and do not break the test socket pins Receptacles 240pin DDR2 Adapter with Test Sockets removed MMMM TOUA THER TNA MO MA AAA 1 Sil sii Ls 4 zii a ei 240pin DDR2 Adapter with Test Socket ready for insertion CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 45 5 3 General Troubleshooting Guide The SP3000 memory tester is designed to last for many year but certain parts of the memory tester are made of plastic and may might break if mishandled On the bottom of the DDR DDR2 DDR3 test adapter a pair of 100pin female Robinson Nugent connectors breaks easily by the corners Be very gentle when inserting the test adapter into the SP3000 base tester Intermittent failures Tester unable to power up Unable to program SPD 5 3 1 SP3000 LCD Error Message CST Inc SP3000 DDR3 1333Mhz Rev 3 93 f6 File Config SPD AutoID CST Inc Copyright 2008 All Rights Reserved SP3000 Initializing Corrective action Remove and insert SP3 Adapters firmly on the SP3000 base tester Be sure to turn off power before removing adapter Blank Screen or Black Line across LCD Corrective action Remove adapter and check EEPROM on sockets l
12. 33 1066 800 MHz DIMM Memory Test System 47 Step 4 The SP3000 tester has detected the PC software and the following window will appear ES SP3000 DDR3 Advanced PC Software 8 06 Engineer level File Action Config Module Picture Test Report Help DSQUHimsskan CST INC SP3000 DDR3 1333 rev3 20S c1l File Config SPD AutoID e Q ke Step 5 Load Flash This option allows for a selection for a flash download to update new Firmware releases on the SP3000 DDR3 Tester This is a quick way to re program the firmware version on the Flash EEPROM of the SP3000 tester for any new firmware releases New firmware releases for upgrade of your existing SP3000 tester will be delivered in a 3 5 floppy diskette or by email Alternatively you may choose to download the firmware from CST s website at www simmtester com To do this store it in a PC Hard Disk and download into the SP3000 EEPROM Click the Icon and make sure the SP3000 is connected to the PC using the serial RS232 cable The communication baud rate speed has to be set correctly for proper communication interfacing with the SP3000 The SP3000 PC software has an automatic Com Port scanning software to determine the baud rate and locate an available Com Port on your PC After the selection it will take you to the Open Flash EEPROM File screen as shown in Figure to select the Firmware to download All DDR3 Firmware are coded as DDR3 XX BIN Downlo
13. 55 Esc Toggle gt OK SPD Write 000 gt 255 Ese Toggle lt Press gt key to Mask Out Byte 120 125 which is used for programming serial number and date codes This bytes are unique number and ignore during SPD data comparing Mask Out Byte 120 125 Yes Ese JI Jf No OK Read Cmp enable user to compare SPD data with the SPD data saved in the file or from the SP3000 tester buffer NO SPD rewrite is possible for this mode selection SPD Data Test allowed RD Cmp Ese lt gt A OK WR Cmp Allow user to compare SPD data with the SPD data saved in the tester s buffer and allow SPD rewrite after passing all functional test Be careful when CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 17 selecting this function The original SPD data from the DIMM EEPROM will be overwritten SPD Data Test allowed WR Cmp gt MN OK For permanent amp reversible write protect setting read chapter 4 5 page 39 for details 3 2 Auto ID Menu The automatic identifying Auto ID device functions allow user to determine the configuration size speed etc of the unknown module under test The following parameters will be determined Device Operating Voltage VDD 1 5V Rows configuration Columns configuration Number of data lines Number of banks Internal amp external Access time 3 2 1 From the main menu
14. 800 MHz DIMM Memory Test System 22 000 00 01 02 03 04 05 06 07 08 09 0A OB Scroll Prnt Prnt sent to Print SPD content from the tester buffer 3 4 4 Volt D C Voltage Parameters Sub Menu When testing any module an upper or lower voltage limits are necessary The VCC voltage setting in this menu allows user to perform this task 3 test voltages are selectable e For 1 5V Module Voltage adjustable are 1 4V 1 5V and 1 6V The software Bouncing option when enable permits voltage cycling eg for 1 6 V device 1 6 1 5 1 4 Vcc 3 Voltage settings for selection 1 4V gt 1 5V gt 1 6V Vcc 1 5V Bounce No Vdd Bounce OK Bounce _ Voltage Bouncing Yes or No 3 4 5 Timing Clk Frequency Refresh Parameters Sub Menu CLK 400 Mhz Clk Frq MRO J MRI MR2 OK Clock Frequency MHZ 400 ESC JI It ft gt OK e Clock Frequency can be preset from 400 670 MHz in steps of 5Mhz e MRO Mode Register Set for setting CAS Latency Trcd Trp 8 Write Latency e MR1 Extended Mode Register Set for setting Output D I C ODT resistor value e MR2 Extended Mode Register Set for setting CAS Write Length Refresh rate MPR Disable ODT CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 23 For MRSO Setting Mode Register Set CL 7 Wr 7 Trcd 7 Trp 7 CasLat WR Tred Trp OK Most DDR3 1066Mhz DIMM are preset with CL 7
15. AS Write Latency 5 6 7 8 9 Refresh 8 16 32 64 amp 128 us Self amp CBR Test Pattern Assembly Check Walk Data Walk Address Chk_CS ChK_CKE ChK_DQS Chk_DQM amp SPD_Address Test Functional Mat S Mar_X Mar C Mar_Y Mov I Programming SPD Read SPD Write CRC Checksum Auto calculation Power Requirements e Power Adapter Input 100 250Vac Frequency 50 60 Hz Output 12V 3A Operating Temperature e 32 F to 100 F 0 Cto 60 C Physical Dimension e LXWxH 9 30 x 9 25 x 2 00 236mm x 235mm x 51 mm e 6lbs 3Kg CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 3 Operating Basics his chapter guides you through the SP3000 DDR3 test system basic menu operation The SP3 204 DDR3 SODIMM Adapter is required to be attached to the base SP3000 Tester for DDR3 SODIMM Module Testing e Unpack the tester from the box e Connect the DC Power adapter to the SP3000 Tester e Plug on the required Test Adapter to the SP3000 Tester e Switch off Power before changing a different test adapter e Turn on the Power Switch at the rear of the tester e A Sign On Message will be displayed on the LCD DDR3 Adapter DDR3 1333 MHz Firmware Adapter VXx xx FPGA Version xx CST Inc SP3000 DDR3 1333 rev3 20 c1 File Config SPD Auto ID e The SP3000 tester is ready for testing the DDR3 DIMM module CAUTION Ensure the Power is turned off before removing o
16. COMPUTER SERVICE pp TECHNOLOGY Inc SP 3000 DDR3 Memory Tester 240pin DIMM 1333 1066 800 MHz SP3000 DDR3 1333 240pin DIMM Manual Revision 6 2336 LU FIELD ROAD DALLAS TEXAS 75229 USA e Tel 972 241 2662 Fax 972 241 2661 Email info simmtester com e website www simmtester com CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System Table of Contents Table of Contents Page Warranty General Safety Notice 1 Unpacking and Inspection 2 The SP3000 memory tester 2 1 SP3000 Product overview 2 2 Sp3000 System Hardware 2 3 Specification 3 Operating Basic 3 1 Configuration menu setting 3 2 Auto ID Menu 3 3 File Menu 3 4 Edit Menu 3 5 Test Menu 3 6 Result Menu 3 7 File Save Delete Menu 4 Quick Guide with Examples 4 1 Auto ID an Unknown Device 4 2 Test a Known Device 4 3 Changing Test Parameters 4 4 Test a Device and Program SPD All in one key punch function 4 5 How to set the Permanent SPD Write protect and Reversible write protect 4 6 How to decode memory error on the SP3000 5 SP3000 Basic Mainteance 5 1 General Cleaning 5 2 Replacing Worn Out Test Socket 5 3 Troubleshooting Guide 5 4 Tester Firmware Upgrade CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System AAN Warranty All components used in CST product are of the highest commercial grade available Furthermore each product is subjected to a very rigid test program during and after ass
17. Data Mask DMO 7 Power Supply 1 5V VDD Power Supply for DQS 1 5V Ground VSS Power Supply Reference Vref Serial EEPROM Power Supply 2 3V 3 6V VddSPD SPD Serial Data I O SDA SPD Serial Clock SCL SPD Address in EEPROM SAO0 2 No connection NC CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 40 4 62 SP3000 Error Message The following test pattern must be enable on the SP3000 tester in order to capture the following errors Walk address Walk data Marching Chk CS Chk DQM Chk DQS Chk CKE Chk ODT SPD Address SPD RC WRC Address Pin A0 A12 open and short Walk Address failure Bank Select Address BAO BA1 open and short Walk Address failure Data Input Output DQO DQ63 open and short Walk Data failure Data Strobe DQS 0 DQS 8 open and short Walk Data failure DQS failure Clock enable input CKEO CKE1 open and short Auto ID half bank and CKE failure Chip select input CS0 CS1 CS2 CS3 open amp short Walk Data failure and CS Failure Row address Strobe RAS open and short Cannot Auto ID amp Walk Address failure Column address strobe CAS open amp short Cannot Auto ID amp Walk Address failure Write enable WE open and short All test fail On Die Termination ODT ODT test fail Check Bit ECC for 72 bit DIMM CBO CB7 open and short Walk Data failure Data Mask DMO 7 DM test fail Power Sup
18. ad Click to download firmware from CST web site Locate EEPROM binary file CADDAZ2 97 BIN Start Close Once the file is selected and the OK button activated you will find a warning message If the selected file is to download is incorrect it will cause the SP3000 system to erase and be non operational CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 48 Please note that you should never interrupt the programming cycle until the programming is completed and the screen message shows Programming Complete Complete Flash download time takes approximately 2 minutes Interruption will cause the SP3000 system to be erased and being non functional Update Firmware Download Gli k to download fimwate fiom CST web site Locate EEPROM binary file Step 6 The SP3000 DDR3 Tester display will prompt Programming Completed on successful attempt and a SP3000 Reboot is necessary to verify if Flash upgrade have been successful gt please restart SP3000 Q CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 49
19. amaged to the Memory tester do not expose it to sprays liquids or solvent 5 1 Cleaning Inspect the SP3000 Memory tester as often as operating conditions require To clean the Memory tester exterior perform the following steps Remove loose dust on the outside of the Memory tester with a lint free cloth Use care and avoid scratching the clear LCD display Use a soft cloth or paper towel dampened with water to clean the memory tester You can use 75 isopropyl alcohol solutions for cleaning The Yamaichi test socket requires regular cleaning use Electronic Contact cleaners or Alcohol to clean the gold contacts only CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 43 Yamaichi test contact pins require regular cleaning with electronic contact solvents A clean contact will shine New Yamaichi test socket with perfect socket guide for proper alignment Worn out socket guides can caused misalignment during module insertions on tester Worn out sockets will have to be replaced between 50K 100K insertions CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 44 5 2 Replacing Worn out Test Sockets Inspect the Test socket pins frequently a broken test socket will not test module effectively and have to be replaced Call CST for pricing for the different type of DIMM and SODIMM Test sockets CST Testers are designed with easy to replace test sockets All CST SP300
20. ass WA Fail WD Walk Data Failure at Data bit 16 18 During RMA repair the repair technician would usually removed the chip connected to U2 DB 16 23 and replaced the faulty U3 chip with a known good chip After rework the module with the Data bit failure will be retest to ensure module can pass all the test pattern Marching failure when U1 has bad internal failures DB 2 8 3 module failed when installed in the PC Symptoms Blue screen Fail Mats 2x533 MH L001 00 17 Main Result Print View Test Pass WA WD Fail Mt Mat S Failure at 2 3 Data bit 2 3 Bank 1 During RMA repair the repair technician would usually removed the chip connected to U0 DB 0 7 and replaced the faulty U1 chip with a known good chip After rework the module with the failure will be retest to ensure module can pass all the test pattern CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 42 5 0 SP3000 General Care 8 Trouble Shooting Protect the Sp3000 tester and Test adapters from adverse weather conditions The memory tester are not waterproof and require gentle handling went operating Tester Do not press the metal part of the tester with heavy force during insertions of memory module during production testing Pressing against the metal part of the tester may caused the tester PCB to bow in the middle causing the electrical components to break Caution to avoid d
21. ations sub menu System Configuration Sub Menu 1 System Configurations Esc 1 CrDev Defaut Scroll System Configurations Esc Comm Print Handir Scroll Step 3 Select Scroll then AutolD will prompt the Default Auto ID Setting function System Configuration Sub Menu 2 Default AutoID Settings Ese JI SPD Pattn Select Pattn bring you to the Default Pattern setting This setting will be retained even if you turn the power off the tester Go through and activate the parameters that you want the module to be tested by For Open 8 Short test activate x Jw_data x w_addr For Cell test on Chip activate x mt and or For SPD test the following must be activated x JspdRC x Jspdaddr x w_data x w_addr mt Toggle lt gt OK Jes dqm x spdRC x spdaddr Toggle lt gt OK CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 36 Select OK to go back to System Configurations sub menu 2 System Configuration Sub Menu 2 Default AutoID Settings Esc JE SPD Pattn Step 4 Select SPD to go to the SPD default configuration menu Setting in this menu will be retained even upon power down of tester e The Write Page Length is set according to EEPROM specifications e The SPD Read SPD Write specify the read and write range e Mask out Byte 120
22. aud rate 19200 Ese JE Toggle OK Press Esc key return to Main Menu Press Toggle key edit the baud speed setting Baud rate setting available are 19200 9600 4800 2400 amp 1200 Press OK key return to the System Configuration menu Factory default Baud Rate setting is 19200 3 1 4 Print Menu The Print function enable the selection of paper or form feed to the printer connected Form Feed Yes JE JE F F OK F F key toggles the Form Feed between Yes or No OK key return to the System Configuration menu 3 1 5 Handler Menu The Handler function allow the user to enable or disable the Handler control when interface with any CST s RoboFlex2 Automatic Handler System Handler Off Sort 1000 ms On 1s s OK 3 1 6 Default Auto ld Settings The Default Auto ID Settings function enable user to pre select the default test patterns during the Auto ID stage The default test pattern can be used when the selected test pattern is activated The user may edit the default test pattern by using the Edit function key for that particular test routine Default Autold Settings Ese Il SPD Patn Esc Returns to System Configuration menu CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 14 Patn The Patn or Pattern function brings out the following test patterns which user can define as defaul
23. ce attribute The BASIC test is performed to determine if the module is good or bad So lets run through the steps Step 1 Insert the unknown DDR3 DIMM device into the test socket The main menu screen will display as follows CST Inc SP3000 DDR3 1333 Mhz Rev 3 xx xx File Config SPD AutoID Step 2 Select Auto ID and you will be prompted the following menu Make your selection according to Data rate required to test the module at select 400 533 amp 667 Mhz if you are unsure Select Clock Frequency 800 1066 1333 Wait for a few seconas Identifying the Device 00 03 Step 3 Compare the device attributes shown on the LCD Display with your known device attributes 1GB DDR3 DIMM 1066Mhz DDR3 128Mx64 1GB 1B 8 2x 533 Mhz 1 5V Esc Edit Defset Test CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 30 Indication of Device are as follows DDR3 Double Data rate DIMM 4 128Mx64 Address base x Data Bit configuration of module 1GB Memory Size 1B External Bank eg One external bank 8 Internal Bank eg Eight internal bank Vdd Vdd voltage eg 1 5V Step 4 Press Test to perform the BASIC Test L001 ICC Current 00 01 Cancel L001 Walk Data 00 02 Cancel 00 03 PASS L001 2x 533Mhz 00 05 Esc J Result Print Test Step 5 Press Result
24. detail Press OK to return previous LCD display 12 17 19 Bank 1 Results indicates Module Fail Bank 1 Data bit DB12 DB17 19 Press Esc twice to the main menu End of example CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 32 4 3 Changing Test Parameters Whenever the Auto ID or File options is selected The Test Parameters can be changed by selecting the Edit key This section illustrates how to activate the MAT S test and change the Operating Voltage Vdd to either 1 4V 1 5V 1 6V and activate Chk_CS and Chk_DQM test Steo1 Select File Menu then Std to standard device Use Next Key to scroll to DDR3 128Mx64 device Press Edit to edit the device 1 gt DDR3 128Mx64 1GB1b 8 2x533Mhz 1 5V Esc Edit J Next Test Step2 Press Edit for more parameter options 1 DDR3 128Mx64 1GB 1B 8 2x533Mhz 1 5V Ese AdrDat BnkCtl Pattn Scroll Step 3 Press Scroll for more parameter options 1 gt DDR3 128Mx64 1GB 1B 8 G2x533Mhz 1 5V Ese Volt Timing SPD Scroll 1 gt DDR3 128Mx64 1 GB 1B 8 2x 533Mhz 1 5V Esc F Name P Heat Type Scroll Step 4 Choose Volt to edit VDD Vdd 1 5V Bounce No Vdd Bounce OK Step5 Toggle Vcc until 1 6V is displayed press OK to return to previous menu 1 gt DDR3 128Mx64 1GB 1B 8 2x533Mhz 1 6V Esc Volt Timi
25. e executed in the same cycle after the rest of the test pattern is completed when activated e SPD_WRC SPD Write and compare Data Test writes data into Byte 0 255 on the DIMM Blank SPD EEPROM and compared with SPD Data stored in Buffer When SODIMM SPD EEPROM does not match Buffer Data tester will fail SPD Data test The SPD test can be executed in the same cycle after the rest of the test pattern is completed when activated e SPD CRC Checksum calculation Byte 126 127 is offered as a standard feature for DDR3 SPD programming CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 16 3 1 7 SPD Setting Default SPD The SPD function are used for the following SPD setting which user can define as defaults SPD parameters to be used whenever a module is selected to be programmed Default Auto Id Settings Ese JE SPD Patn Press SPD key return to change SPD setting WRT Page Length 4 Ese IE Il OK Press gt key to change the Write Page length setting to 1 4 8 8 16 bytes Page length setting is dependent on the specification of the EEPROM SPD Programming time can be speed up with a higher byte length setting check the EEPROM manufacturer specification to determine the appropriate page length setting CST recommends Page Length 4 to support most EEPROM Press gt key to Specify SPD Read Write Range Typical 0 255 SPD Read 000 gt 2
26. embly and prior to shipment Nevertheless as with all components and equipment there could be a certain small percentage of failure CST Inc warrants for a period of one 1 year from the date of purchase by the original customer all products manufactured by it to be free under normal use and service from defects of material and workmanship During this period if the product unit is determined to be defective return it to your original place of purchase They will promptly at their option repair or replace the defective unit This warranty shall not apply to any consumable parts beyond its expected usable life cycle specified in the specification section This warranty shall not apply to any product which has been repaired or altered in any manner by anyone other than CST Inc or products which have been connected installed used or otherwise adjusted other than in accordance with written instructions furnished by CST Inc The above warranty shall not apply to defects resulting from improper or inadequate maintenance by customer or operation outside of the environmental specifications for the products The above warranty shall not be extended beyond its original term with respect to any part or parts repaired or replaced by CST Inc No person including any dealer agent or representative of CST Inc is authorized to assume for CST Inc any obligation or liability other than expressly stated here CST Inc does not assume any liabili
27. ep 13 Step 14 Press the Esc key until a save file menu appear Do you want to save this file F Name No Yes Select F Name to edit filename Use or keys to change the character and gt to move to next character position press OK when done File Name DEMO I It gt NM OK Do you want to save this file F Name No Yes Press Yes to save The Used Saved Dev updated from 0 to 1 Std Dev 1 User Saved Dev 1 Ese Std User This ends the example CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 35 4 4 Test a Device and Program SPD All in One Key Punch Function Assume device needs to be tested for functions and also be programmed with the SPD content To continue find a sample module with the correct SPD content that you intend to duplicate the information to other modules to be tested and programmed and set the tester configuration as follows Step 1 Insert a good DDR3 DIMM with known good SPD content into the test socket From the menu screen select the SPD function and this will prompt the following screen CST Inc SP3000 DDR3 1333 Mhz Rev 3 20 f6 File Config SPD AutoID All Settings selected under Config is retained even when the tester is powered down If user wished to change certain default settings go into Config Menu to edit again Step 2 Select Config will prompt the System Configur
28. est pattern at factory setting walk address walk data amp mat s Press Comm key bring up the Com Port Menu Set RS232 communication baud rates Press Print key bring up the Printer Menu Select printer form feed format when printer is connected directly to SP3000 printer port Press Handilr key to bring up the Handler setting Menu Function to enable or disable Handler mode for manual testing ensure Handler is turn OFF Press Scroll key to bring up the Defauk Auto ID Setting Menu 3 1 1 Clear Device Menu This menu enable user to clear out previous old device library stored in the SP3000 base tester the SP3 DDR3 adapter enable user to create and store up to 8 users define device library 3 1 2 Default Menu This menu enable user to quickly restore test pattern setting including the burst length to its factory default setting When the default key is selected the following test pattern is set as a default Walk address Walk data Mat_S CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 13 3 1 3 Com Port Menu This menu enable user to redefine the baud rate between the PC and SP3000 When user opt to use the PC to display the SP3000 screen output or for performing a Firmware update the SP3000 Tester can connected to any PC s Com port with the use of a Serial Cable An Advanced PC software will be required to communicate with the SP3000 tester When Comm Menu is activated B
29. ffective solution for service professionals especially in incoming inspection engineering field service depot support system integrators resellers system subsystem manufacturers and any industry where memory is used 2 1 SP3000 Product overview Adapter Option SP3 240pin DDR2 DIMM Adapter LED Status Indicator LCD Display Function Keys CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 7 Rear Panel SODIMM DDR3 Test Adapter Socket Power Switch DC Input RS232 Parallel Port Port This chapter highlights the key features of the SP3000 DDR3 DIMM Tester Hardware and software are covered in this section 2 2 System Hardware Light weight portable universal stand alone memory tester Easy to use Uses a powerful amp high speed Motorola micro controller to manage the I O task such as LCD Display function keys printer etc An allocated system storage space is used to save the test parameter erasable and programmable data will not be lost even when the power is down The interface to the device under test utilized sophisticated customized designed chips for easy error detection of problematic modules 2 lines by 40 alphanumeric characters LCD display shows clear instructions and test results Test results can be printed to printer through the on board parallel port Optional PC interface kit enable testing through PC control software 5 programmable function keys are i
30. ftware Write Protect registers or Reversible Software Write Protect registers during SPD programming Byte 0 to byte 255 of the SPD is protected by the PSWP and RSWP e Permanent Software Write Protect PSWP when enable during programming the EEPROM cannot be rewritten again once the PSWP register is set The software protection starts from Byte 0 255 of the SPD EEPROM e Reversible Software Write Protect RSWP enable the EEPROM to be reset and rewritten again from Byte 0 255 many times Important Notes The Permanent amp Reversible Write Protect can be enable from the SP3000 tester The selection to set clear Permanent and Reversible is not available from the Advanced PC software This is to prevent user from enabling the Write protect registers by accident e On startup insert module and identify the module e Ensure the current SPD data is saved on the tester e Select Edit gt Scroll gt SPD e Select Scroll gt Scroll and the following menu will appear DDR3 128Mx64 1GB 1B 8 2 x533 mhz 1 5V Esc Volt Timing SPD Scroll 000 00 01 02 03 04 05 06 07 08 09 OA OB Scroll Save Config Read OK 000 00 01 02 03 04 05 06 07 08 09 OA OB Scroll W DUT Edit J OK Set Write Protect 000 00 01 02 03 04 05 06 07 08 09 0A OB status to EEPROM Scroll Print Set SWP ClrSWP registers f PSWP Clear RSWP Clear a E PSWP RSWP i 0r J CST I
31. ge is between 8 and 16 For Data Range is between 1 and 72 For Banks Range is between 1 and 4 All DDR3 Chip has 8 internal banks 3 4 2 Bank Ctl JBank Control Sub Menu e This menu enables changes for the RAS and CAS control signals of each bank The program will first display the RAS Control Menu then followed by the CAS Control Menu Ifthe module has more than 1 bank the program repeatedly shows the RAS Control and CAS Control Menus until last bank has been modified When a CS is enabled the LCD Display will show a _ enclosing the number otherwise it is disabled Bank No Total Number of CS Control Menu Banks S 0 1 2 3 Bank 1 Esc Toggle lt gt OK Toggle Enable or Disable the current Chip select setting x indicates enable gt Rotate the underlined cursor to next CS selection OK complete the changes CKE Conirol Menu CKE 0 1 Esc Toggle lt Toggle Enable or Disable the current CKE setting gt Rotate the underlined cursor to next CKE OK complete the changes DQS Data Strobe Control Menu DQM 0 1 2 3 4 516 7 8 Bank 1 Ese Toggle lt lE CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 21 Toggle Enable or Disable the current DQS setting gt Rotate the underlined cursor to next DQS OK complete the changes DQM C
32. nc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 39 Set Reversible Write Protect registers Set Permanent Write Protect PSWP Set RSWP Clear PSWP RSWP OK Clear Reversible write protect registers To clear RSWP Write Protect feature 000 00 01 02 03 04 05 06 07 08 09 OA OB Scroll Print 1 Set SWP ClrSWP Clear Reversible SWP 0 2 222 Yes ESC NO OK Return to main screen and test module the EEPROM will either be Permanent or Reversible write protect after programming 4 6 How to decode a DDR3 Memory failure test results using the SP3000 The SP3000 DDR3 tester is designed with an advanced Fault capturing algorithm capable of pinpointing the exact failure components There are many kind of faults which could possibly surface during module assembly 4 61 For DDR3 Memory Standard Pin Description Address Pin A0 A12 open and short Bank Select Address BAO BA1 open and short Data Input output DQO DQ63 open and short Data Strobe Input output DQS 0 DQS 8 open and short Clock enable input CKEO CKE1 open and short Chip select input CS0 CS1 CS2 CS3 open and short Row address Strobe RAS open and short Column address Strobe CAS open and short Write enable WE open and short On Die Termination ODT Check Bit ECC for 72 bit DIMM CBO CB7 open and short
33. ncluded for all the menu options DDR2 Test Adapter Available SP3 240pin DDR2 DIMM Adapter 1066 800 667 533 400 MHz SP3 200pin DDR2 SODIMM Adapter 800 667 533 400 MHz SP3 DDR2 BGA Chip Adapter 800 667 533 400Mhz SP3 DDR2 BGA POGO Pin Chip Adapter 800 667 533 400Mhz DDR Test Adapter Available SP3 184pin DDR DIMM Adapter 500 400 333 266 200 MHz SP3 184pin DDR DIMM Adapter 440 400 333 266 MHz SP3 200pin DDR SODIMM Adapter 400 333 266 200 MHz SP3 66pin DDR TSOP Chip Adapter 333 266 200 MHz CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 8 SDRAM Test Adapter Available e SP3 168pin SDRAM DIMM Adapter 133MHz Max e SP3 168 144 pin SDRAM DIMM SODIMM Adapter 133MHz Max e SP3 100 pin SDRAM DIMM Adapter Other Test Adapter Available e SP3 72 168 pin DRAM SIMM DIMM Adapter SP3 30 72 168 pin DRAM SIMM DIMM Adapter SP3 144pin SGRAM Adapter SP3 72 144pin DRAM SODIMM Adapter SP3 100pin DRAM DIMM Adapter SP3 Sun SPARC 200pin Adapter SP3 PCMCIA DRAM Card Adapter SP3 DDR 400Mhz Adapter SP3 DDR2 800 MHz Adapter CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 2 3 Specifications Memory Type 240 Pin DDR3 DIMM SDRAM Form Pinout 240nin Unburterea IMM A DIM Variable Test Voltage Vdd 2 0 1 9 1 8 1 7 1 6 1 5 1 4 amp 1 35 V Variable AC Parameters CAS Read Latency 5 6 7 8 9 TRCD 5 6 7 8 9 TRP 5 6 7 8 9 AL 0 1 2 3 4 C
34. ng Pattn Scroll Step 6 Select Pattn to enter into the Test Pattern Menu Test adr dat mt PagelL001 Esc Basic Custom Loop CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 33 Step 7 You can either choose to change the pattern from the Basic function for quick setup or from the Custom function for detail setup Select Basic to view test pattern setup Press Mat toggles between March or Basic Test wD wA Esc Mat Custom Loop Step 8 Select Custom to customize the test pattern Test adr dat mt L001 Esc Basic Custom J Loop Steo9 Use gt lt key to scroll cursor to Mt press Toggle to active test The x Mt will appear marked to indicate x w_addr x w_data x mt Mar_X Toggle lt gt OK Step 10 press gt lt key to scroll menu to CS test and press Toggle to activate test The x CS_test will be marked to indicate test selected Mar C X chk c s X chk_dqm Toggle lt gt OK press gt lt until cursor moves to the end of menu spd_Re spdaddr Toggle lt gt OK Press Done to return to previous menu Test adr dat mt PagelL001 Esc Basic Custom Loop CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 34 Step 11 Step 12 St
35. ny time By performing a save function the previous saved file with be overwritten with the current set of saved data Once all the tester have been configured according as above you are ready to Test and Program the SPD on each and every module under test proceed to Step 6 Select Auto ID and the following menu will prompt for selection Make your auto ID selection Select Data Rate 800 1066 1333 DDR3 128Mx64 1GB 1b 8 Q2x1066 Mhz 1 5V Esc Edit I Next Test Select Test to test the module If module is good and the SPD programming is successful the following menu will be displayed PASS L001 2x533MH 00 05 Main Result Print Test Select Result to view the parameters that were active during this test Pass wD wA mt spdRc spdaddr 00 07 Fail OK Click OK and you can continue the test with another module This ends the example Setting Serial Number increment during SPD programming can only be executed using the SP3000 Advanced PC software Refer to the SP3000 PC software user manual for details on how to enable the SPD serialization during SPD programming CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 38 4 5 How to set the SPD EEPROM Permanent Write Protect and Reversible Write Protect DDR3 SPD EEEPROM uses a special function build in the EEPROM chip to enable manufacturer to set a Permanent So
36. ocated on the bottom of the adapter CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 46 5 4 Upgrading the SP3000 DDR3 Firmware CST often release new firmware updates every 6 monihs for all of the adapters especially for the newer DDR3 adapter When an upgrade is necessary you will be notified by CST Installing firmware Step 1 You need to purchase PC Kit from CST a kit consist of a PC software and a RS232 Communication cable Step 2 Install the PC software and connect the SP3000 to the PC RS232 Port Connect the Serial RS232 cable with DB9 pin connector to the SP3000 s RS232 port located at the rear of the tester the other end of the connector is connected to an available Com Port on your PC Rear view of PC Chassis OFF ON 12VDC RS232 PRINTER i Serial Rear view of SP3000 Tester Cable SP3000 PC Interface Control Setup Step 3 Double click on the SP3000 PC Control icon brings up the Startup Screen displaying the information and version of the SP3000 PC software JEDEC SPD Specification a Remove 5P3000 DDR3 8 05 Beta BA SIMM DRAW LA 5P3000 DDR3 8 05 Beta At this point if the hardware connection and software interface has been setup correctly what you see on the tester LCD screen will be simultaneously displayed on the PC software communication setup CST Inc SP3000 240pin DDR3 13
37. ontrol Menu Data Mask Enable Module with DM 0 8 controls Toggle OK DM ON U2 03 4 105 61071 8 Bk 1 Ese Toggle lt gt OK 3 4 3 SPD Sub Menu The Serial Present Detect S P D is used by DIMM Memory manufacturer to indicate the configuration speed and some other specifications It is done so by selectively programming the serial EEPROM on the DIMM modules 000 80 08 08 OE 0A 50 40 07 08 09 0A OB Scroll Saved Config Read OK Saved Accept the read SPD information and save to Tester Buffer Config Change SPD parameters Read Read SPD data from module s EEPROM inserted on the DUT O K Accept the changes made in this menu and return to previous menu Scroll Go to next page of SPD setting menu 000 00 01 02 03 04 05 06 07 08 09 0A OB Scroll W gt DUT Edit I Ok W DUT Write SPD Data from into SPD EEPROM into Device Under Test Edit Edit SPD data enable user to scroll byte by byte to edit SPD data 000 00 01 02 03 04 05 06 07 08 09 0A 0B Scroll Prnt SetSWP ClrSWP B 000 Number of Bytes Written 80h OK gt gt Toggle Back Next gt gt Double arrow enables user select which two hex digit to edit Toggle Toggle enable user to set Hex number Back Next Back amp Next key to scroll forward or backwards to select byte CST Inc SP3000 240pin DDR3 1333 1066
38. out cover To avoid electric shock or injury do not operate this product with safety covers or panels removed Do not operate in Wet Damp Conditions To avoid electric shock do not operate this product in wet damp conditions CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System Notice Unless otherwise stated the information contain in these documents are subject to change without notice CST Inc MAKES NO WARRANTY OF ANY KIND WITH REGARDS TO THIS MATERIAL INCLUDING BUT NOT LIMITED TO THE APPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE CST Inc shall not be liable for errors contained herein or for the incidental or consequential damages in connection with the furnishing performance or use of this material CST Inc assumes no responsibility for the use or reliability of interconnected equipment that is not furnished by CST Inc This document contains proprietary information that is protected by copyright All rights are reserved No part of this document may be photocopied reproduced or translated to another program language without prior written consent of CST Inc The information contained herein has been prepared by CST Inc solely for use by CST Inc s employees agents and customers Dissemination of the information and or concepts contained herein to other parties is prohibited without CST Inc s prior written consent If you required further assistance with this p
39. play will indicate an OK key to show the last page Pressing the key will return you to the previous menu CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 27 3 6 2 Print Error Results The Print function allows the user to output Error Results to the printer A sample printout can be seen as follows OO CST Inc SP3000 DDR3 1333 Mhz Rev x 3 03x Module DDR3 128Mx64 1GB 1B 8 2x533mhz 1 5V Addr row x col 14x 10 Data bank x bi 1x 64 Internal Bank 8 Test Pattern w addr w data mt s Loop 1 OOO O FAIL Walk Data Loop 1 Bank 1 1 3 5 7 9 11 13 15 17 19 21 23 27 29 31 32 Elapsed Time 00 00 04 O O OOOO O Or O O OO O 0O O20 nO 3 6 3 Check Result This menu allows user to check back which test has passed or failed Pass dat adr Fail mat 3 7 File Save Delete Menu 3 7 1 Save File After Auto ldentifying a new device and pressing ESC to return to the main menu or Editing an existing device and pressing ESC to return to the main menu The tester will prompt you to the following message Do you want to save this file F Name No Yes F Name Place a 8 char file name for further reference You can also access from Edit Menu 3 Yes Save file Maximum 8 files allowable to be saved if files exceeds then the following prompt will appear It you press Yes Files Full Delete old files No
40. ply 1 5V Vdd Cannot Auto ID All test fail Power Supply for DQS 1 8V Cannot Auto ID All test fail Ground VSS All test fail Power Supply Reference Vref Tester not capable of detect Vref fault Serial EEPROM Power Supply 2 3V 3 6V Vdd SPD Unable to Read amp Program SPD SPD Serial Data I O SDA Unable to Read amp Program SPD SPD Serial Clock SCL Unable to Read amp Program SPD SPD Address in EEPROM SA0 2 SPD Address failure No connection NC Tester not capable of detect NC fault Example of common memory error capture by the SP3000 Test Pattern selected on SP3000 Walk Address Walk Data and Mat S Pattern Walk Address failure when ECC x72 bit are open Data Bit 64 71 will be detected as faulty Fail wk_add 2x533 MHz L001 00 02 Main Result Print View Test Pass Fail WA Address Failure At Data bit 64 71 A0 A13 64 71 Bank 1 CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 41 During RMA repair the repair technician would usually removed the chip connected to U8 DB 64 71 and replaced the faulty U9 chip with a known good chip After rework the module with the address failure will be retest to ensure module can pass all the test pattern Walk Data failure when Data Bit 16 17 8 18 are shorted Fail wk_data 2x533 MH L001 00 02 Main Result Print View Test P
41. r replacing Test Adapter or Test Socket If the above LCD screen message does not appear the adapter firmware may be corrupted CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 11 CST INC SP3000 DDR3 1333 Rev3 20 c1 Line 1 Sign On I File Config I SPD If AutoID 1 Line 2 Main Menu Function Keys Basic SP3000 DDR3 Test Screen The 2nd line on the LCD display usually denoted as the key functions corresponding to the key buttons in line below the display Basic Menu Organization Main Menu NO Calibration required for DDR3 Type 240 pin 800 1066 1333Mhz Standard Devices Result Menu _ Read SPD Edit SPD WriteSPD Printspp J CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 12 3 1 Configuration Menu setting The Config Configuration menu allows selection for the following system configuration setting System Configurations Ese 1 ClrDev Defaut Scroll System Configurations Esc Comm Print Handlr Scroll Selecting Scroll brings up this Menu System Configurations Ese Il Il AutoID Default AutoID Settings Ese JI SPD Patn Return to Main Menu Press ClrDev key bring up the Clear Device Menu Clears all stored device file from SP3000 base tester Press Default key bring up the Default setting Menu Clears previous pattern setting and resets t
42. rameters Edit Menu 2 DDR3 128Mx64 1024MB 1B 8 2x533Mz Esc Volt Timing SPD Scroll Volt to edit V d d and Bouncing Timing to edit CIK Frequency Refresh 8 Delays Parameters SPD to edit SPD setting Edit Menu 3 DDR3 128Mx64 1024MB 1B 8 2x 533 Mz Esc F Name P Heat Type Scroll F Name Set File Name P Heat Pre Heat Type Select or Disable Registered Module Edit Menu 4 DDR3 128Mx64 1024MB 1B 8 2x533Mz Ese 1 S O E Scroll S O E Stop on first Error 3 4 1 Addr Data Address Data Sub Menu This menu allowed users to redefine the parameters on Blinking Cursor Indicate that current editing parameter Eg Row Row 14 ol 10 Data 64 Banks 2 8 _ J gt OK HM Address Setting Number of Rows Number of Columns Number of Banks HM Number of Data Bits Hold down and decrement the current parameter by 1 Hold down and increment the current parameter by 1 gt Point to next parameter When the cursor is at Bank item continuous pressing will bring the cursor back to the Row Item CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 20 Note e The program will perform range checking on the current parameter If the value is below the range it will roll to the higher value If the value exceeds the range it will roll to the lowest value For Row and Col Ran
43. roduct please contact CST Inc technical support hot line or authorised representative Technical Support 972 241 2662 USA Hot Line Fax e 972 241 2661 USA Email info simmtester com Website www simmtester com Copyright c 2011 by CST Inc All rights reserved CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 5 1 Unpacking and Inspection Every precaution has been taken to ensure that the product reaches you in fully operational condition If there are any damaged to the packaging or to the product it should be returned to the shipper and CST Inc should be notified immediately Upon unpacking inspect the unit for any obvious physical damage such as broken display indicators buttons and connectors etc If any damage is evident return it to CST Inc or to any authorized representative for repair or replacement Please keep carton box foam packaging material and plastic bags in the event that the unit has to be returned to CST Check missing or damaged test socket pins Check for missing button T S Check LCD for bi A e z gt P3000 DDR3 Tester Accessories SP3000 12 Volts Power Supply RS232 PC PC Cable Optional Installation Software CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 6 nn 2 The SP3000 Memory Tester The SP3000 is a new generation of Memory Testers from CST Inc It is built with state of the art technology to fit the memory
44. t are to use to check for open and short of CKEO and CKE1 on the DIMM module CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 15 e Chk DQM DQM test are to used to check for open and short on the 9 DQM pin DQM 0 8 on the DIMM module e Check SPD_Addr SPD Address Test are used to check for shorts and open on SDA 0 1 2 For Functional Test The following abbreviations are types of functional failures below AF address decoder fault B number of bits cells in the memory word CF coupling faults CFdyn dynamic CF CFid idempotent CF CFin inversion CF SAF stuck at fault SCF state coupling fault TF transition fault W write operation e Mar S Test Modified Algorithmic Test Sequence is a short test that detects all unlinked SAFs and AFs failures e Mar X Test This March X test is used to test for Cfins Afs SAFs and TFs not linked with Cfins e Mar_C Test This March C test is used to test for unlinked CFins Cfids Cfdyns Afs SAFs and TFs e Mar Y Test This March Y test is used to test for linked CFins Afs SAFs and TFs linked with CFins e Mov_I Test This Moving Inversion test is used to test for unlinked Cfids Afs SAFs TFs For SPD Read and Write Test e SPD RC SPD Read Data Test runs the SPD test based on the configuration defined in the SPD menu Byte 0 255 from SPD EEPROM is compared with SPD Data stored in Buffer The SPD test can b
45. ts test patterns to be used whenever a module is selected to be Auto ID or tested WA WD Mt Esc Basic Custom Burst Basic The Basic function select only Walk Address and Walk Data default test This is the quickest test 2 seconds for checking opens and shorts Basic test checks for assembly problem and may not capture DRAM cell problems Burst The Burst function enable user to select the burst type Sequential or Interleave mode and burst length 4 amp 8 Setting the burst length with 8 will soeed up the test time Custom The custom function brings out the following test patterns which user can select as default Custom pattern setting can be saved in either the SP3000 base tester or transfer to PC for storage and recall later for testing x w_Addr x w Data x MatS Toggle lt gt OK Mar_x Mar_C Mar_Y MovI Toggle lt gt OK lchk CS chk_CKE chk DQM Toggle lt OK IspdRC jspd addr Toggle lt gt OK For Assembly Checks e W data Walk Data pattern are used to detect shorts in the Data lines of the module e W addr Walk Address pattern are used to detect shorts on the address lines of the SODIMM module including BA 0 and BA1 e Chk C S Chip Select are used to check for assembly shorts and open on the four CS pins CS 0 1 2 amp 3 of the DIMM module e Chk CKE CKE tes
46. ty for incidental special and or consequential damage of any kind whatsoever and in any event liability shall in no case exceed the original price of the product Implied warranties including without limitation warranties of merchantability or fitness are expressly limited in duration to the one 1 year specified above Certain terms and conditions of the warranty may not apply where local laws prevail CST Inc SP3000 240pin DDR3 1333 1066 800 MHz DIMM Memory Test System 3 General Safety Review the following safety precautions to avoid injury and prevent damage to this product or any products connected to it To avoid potential hazards use the product only as specified Only qualified personnel should perform service procedures Injury Precautions Use proper Power Cord Avoid Electric Shock Ground the Product To avoid fire hazard use only the power cord specified for this product To avoid injury or loss of life do not removed front panel and try to retrieve any components or try to fix any defects without a qualified personnel Do remember to shut down any power source if products are under maintenance This product is grounded through the grounding conductor of the power cord To avoid electric shock the grounding conductor must be connected to earth ground Before making the connections to the input or output terminals of the product ensure that the product is properly grounded Do not operate with
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