E1 and Data Testers
Contents
1. Local language support o o 9 Downloadable software options 5 s Test configuration and results memories 0 2 2 3 Printer interface g Programmable timer 0 2 3 Backlight 7 g LEDs Large display 7 s g E1 circuit testing Balanced and unbalanced G 703 Tx and Rx g Terminated and high impedance termination modes 0 5 2 2 Framed and unframed test signal generation g d n and m x 64 kbps time slot monitoring o 3 gt Pattern generation into n and m x 64 kbps timeslots s g G 821 G 826 M 2100 analysis both IS and 00S Error and alarm generation and analysis J 2 PCM tone generation with variable level and frequency 0 2 2 PCM decoding and audio output i CAS monitoring of all 30 channels 0 2 2 2 CAS history for a single channel a i E1 signal Through mode o a 9 3 n x 64 kbps drop or n x 64 kbps insert g m x 64 kbps drop and insert o 3 Si Sa A and E monitoring and generation NFAS and NMFAS monitoring and generation 3 2 Tx frequency offset d Round trip delay framed and unframed Primary multiplexer testing Pattern into MUX channel and monitoring on E1 signal s E Pattern into E1 signal and monitoring on MUX channel gt X 50 multiplexer testing Datacom circuit testing X 21 V 11 RS422 interface g V 24 RS232 interface sync and async V 35 interface via adapter g V 36 RS449 interface via adapter 3 EIA530 interface via adapter E1 AND DATA TE2. Programmable timers The instrument can be programmed to start a delayed test at a specific date and time for a selectable duration Battery mains operation For field use the instrument has an 8 10 hour battery life using rechargeable and exchangeable batteries Long duration testing can be achieved using the combined AC mains power supply and charger Software options A key feature of the EST 125 and EDT 135 instruments is the ability to load software options to extend testing functionality Application orientated packages A range of application orientated packages is available that combines the instruments with a carefully selected collection of software options and accessories Should requirements change a range of packages is available for upgrading EST EDT instruments to EDT 135 Accessories The ELM 2 accessory allows the instrument to be connected to 2 Mbps lines carrying hazardous voltages and f distortion It removes the DC voltage equalizes the voltage signal and also measures and displays the signal level The V 11 cable test adapter is used to detect a number of common faults on V 11 cables that might otherwise go unnoticed due to the nature of balanced line interfaces E1 AND DATA TESTERS Feature summary E1 Testers E1 and Datacom Testers EST 120 EST 125 EDT 130 EDT 135 General features Remote operation and control d g Autoconfigure Test patterns fixed programmable and ITU T
3. EST 120 with M 2100 G 826 extended PRBS and Level Measurement options EST Gold Package BN4562 26 Includes EST 125 with M 2100 G 826 extended PRBS Pulse Shape Analysis with Level Measurement and Jitter options EDT Platinum Package BN4562 31 Includes EDT 135 with M 2100 G 826 extended PRBS and Level Measurement options EDT Diamond Package BN4562 33 Includes EDT 135 with M 2100 G 826 extended PRBS Pulse Shape Analysis with Level Measurement and Jitter options EDT X 50 Sub Rate Package BN4562 32 Includes EDT 135 with M 2100 G 826 X 50 HCM and V 110 options EDT Frame Relay Package BN4562 36 Includes EDT 135 with M 2100 6 826 extended PRBS Frame Relay and All 1s and All 0s options EDT 130 BN4562 30 Includes EDT 130 with M 2100 G 826 and extended PRBS options EDT Datacom Package BN4562 37 EDT 135 with all software options to comprehensively address datacom testing EDT Complete Package BN4562 38 Includes all software options All complete with AC adapter charger Plug for US Euro UK or Australian voltage User manual Packages include Soft case or small equipment case K1515 download cable plus a choice of three other cables from the cable list All statements technical information and recommendations related to the products herein are based upon informa tion believed to be reliable or accurate However the accuracy or completeness thereof is not guaranteed a
4. BN 4534 00 48 French S C bits BN 4534 00 11 Large Frequency Offset BN 4534 00 19 PCM Alarm Analysis BN 4534 00 26 Extended PRBS BN 4534 00 36 Generator Receiver Interfaces G 703 X 21 V 11 V 24 RS232 V 35 via adapter V 36 RS449 via adapter EIA530 via adapter Physical Connections 3 pin CF connectors 120 Q balanced BNC connectors 75 Q unbalanced 15 way D type 100 Q balanced 25 way D type G 703 Test modes RX mode Framing PCM30 PCM30CRC PCM31 PCM31CRC or unframed G 703 line code HBD3 AMI codirectional V 11 Drop nx 64 kbps m x 64 kbps RX TX As RX plus BER test pattern generation nx 64 kbps m x 64 kbps Drop or insert n and m x 64 kbps Drop and insert n x 64 kbps 2 Mbps internal clock offset up to 150ppm Programmable Si Sa A and E bits and NMFAS Through mode As RX TX modex plus V 11 Drop Insert Drop and insert n and m x 64 kbps Round Trip Delay mode Framed and unframed 2 Mbps Range 0 10s Resolution Ips MUX DEMUX mode G 703 interface as RX TX mode Unframed DTE emulation on V 11 V 24 V35 V 36 Monitor mode Simultaneous monitoring and display of any time slot in both frame and multiframe Simultaneous monitoring and generation of the Si Sa A and E bits of the NFAS Simultaneous monitoring and generation of the NMFAS Level and Frequency mode PCM generation and measurement of sinusoidal signals in a time slot A law coding to ITU T Rec G 711 Tx frequency range Tx level range R
5. Q JDSU E1 and Data Testers ACTERNA TEST amp MEASUREMENT SOLUTIONS EST 120 EST 125 EDT 130 EDT 135 Scalable testing for digital networks Key Features e Provides a scalable test solution for E1 and Data testing applications supported by a large range of software options for E1 services Frame Relay GSM and subrate multiplexing system X 50 HCM V 110 testing e Allows for rapid evaluation of circuits through an intuitive user interface with an autoconfigure feature and large clear results screens Employs a full set of physical layer tests for E1 balanced and unbalanced circuits including BERT VF Round Trip Delay Signal Level Pulse Shape and Jitter Provides standard options for Quality of Service QoS measurements to ITU T G 821 G 826 and M 2100 recommendations e Makes clear distinctions between bit errors and bit slips in QoS testing through the patented Gelbricht synchronization method The range of El and Data Testers provide a scalable future proof solution for the testing needs of engineers involved in the installation commissioning and maintenance of digital networks These instruments can carry out both framed and unframed tests on a wide variety of equipment ensuring that technicians can perform their jobs quickly and efficiently The El and Data testers come in compact robust handheld packages that make them ideal for field use This low cost time saving multiple language solution for E
6. STERS Technical specification Accessories Unbalanced 75 Q BNC 2m x4 K169 Type 43 stub adapter cable for above K1549 Balanced 120 Q CF to 3 x Banana 2m x4 K71 Balanced 120 Q CF to RJ45 K1597 BNC to Siemens 1 6 5 6 K1616 External clock adapter K1513 V 24 download cable K1515 Serial printer cable 25 way K1500 Serial to parallel printer cable K1589 V 11 DCE adapter cable K1505 V 24 DCE adapter cable K1512 V 35 DTE AMP 1 6 mm adapter cable K1508 V 35 DCE AMP 1 6 mm adapter cable K1509 V 35 DTE Positronic 1 6 mm adapter cable K1525 V 35 DCE Positronic 1 6 mm adapter cable K1526 V 35 DTE Positronic 1 0 mm adapter cable K1510 V 35 DCE Positronic 1 0 mm adapter cable K1511 V 36 RS449 DTE adapter cable K1506 V 36 RS449 DCE adapter cable K1507 EIA 530 DCE adapter cable K1629 EIA 530 DTE adapter cable K1630 TSM 10 remote operation software BN 4597 10 ELM 2 Equalizer Level Meter BN 4546 01 V 11 cable test adapter BN 4534 00 37 Equipment case small BN 4523 00 04 Equipment case large BN 4540 00 02 Soft carrying case BN 4518 00 08 Software options available at extra cost French S C bits BN 4562 00 11 X 50 BN 4535 00 14 GSM BN 4534 00 15 G 826 BN 4534 00 34 All 1 s All 0 s histogram BN 4534 00 20 M 2100 BN 4534 00 13 Noise Measurement BN 4534 00 23 V Interface Status Monitor BN 4535 00 28 V 110 BN 4535 00 32 HCM BN 4535 00 35 Frame Relay Enhanced BN 4535 00 41 Jitter BN 4534 00 42 Datacom BN 4534 00 44 V Delay
7. l and Data testing supports a wide range of software options including Pulse Shape Analysis Jitter and Frame Relay all implemented on the same straightforward user interface The generic hardware platform can be configured and optioned to meet the needs of various engineering groups or activities It can also be reconfigured or upgraded as required WEBSITE www jdsu com E1 AND DATA TESTERS The range of products comprizes EST 120 EST 125 EDT 130 and EDT 135 The EST 120 and EST 125 are multipurpose field service testers designed for commissioning maintenance and troubleshooting on E1 PCM circuits They can perform a wide variety of tests including framed and unframed monitoring framed and unframed end to end testing drop and insert channel associated signaling monitoring Round Trip Delay measurement and repeated BERT The EDT 130 and EDT 135 have a similar range of features for E1 circuit testing plus an extended range of interfaces for data circuit and primary multiplexer testing Some of the key functions and benefits of the E1 and Data testers include Ease of use The EST EDT range has been designed with the technician in mind The instruments are lightweight easy to hold and carry and feature a large LCD screen with integral backlight for the most demanding testing environments Rapid fault identification Test results are displayed in a concise graphical format with our recognized big OK when no errors
8. nd no responsibility is assumed for any inaccuracies The user assumes all risks and liability whatsoever in connection with the use of a product or its application JDSU reserves the right to change at any time without notice the design specifications function fit or form of its products described herein including withdrawal at any time of a product offered for sale herein JOSU makes no representations that the products herein are free from any intellectual property claims of others Please contact JDSU for more information JDSU and the JDSU logo are trademarks of JDS Uniphase Corporation Other trademarks are the property of their respective holders 2005 JDS Uniphase Corporation All rights reserved 10143207 500 1005 E1ESTEDT DS ACC TM AE Test amp Measurement Regional Sales NORTH AMERICA LATIN AMERICA ASIA PACIFIC EMEA WEBSITE www jdsu com TEL 1 866 228 3762 TEL 55115503 3800 TEL 852 2892 0990 TEL 49 7121 86 2222 FAX 1 301 353 9216 FAX 55 11 5505 1598 FAX 852 2892 0770 FAX 49 7121 86 1222
9. or alarms are present figure 1 The testers also support multiple languages With comprehensive alarm and errors status LEDs technicians are given a clear indication of problems even at a distance All results and data can be stored for later analysis and printed to an external printer or computer with a single key press Autoconfigure The autoconfigure feature greatly simplifies instrument setup A test can be started on framed or unframed traffic using just two key presses For a framed signal the instrument can determine the framing type timeslot allocation and test pattern type Gelbrich synchronization The patented Gelbrich synchronization method enables test pattern synchro nization and accurate BERT measurement even in the presence of rapid bursts of errors It also differentiates between bit slips and bit errors important in QoS testing Menus BER Hist more Reset Stor figure 1 E1 AND DATA TESTERS Results storage and printing The EST EDT range of instruments has eight configuration and test memories that store test configurations and results allowing them to be viewed or printed at a later time Results are printed through the serial port and a setup screen enables the instrument to be set for a range of serial printers Parallel printers are supported with the use of a serial to parallel converter cable Alternatively printing to a PC can be achieved using a software program such as WG Print Capture
10. x level measurements X 50 Test modes RX TX through D amp I and MUX DEMUX Division 2 and 3 framing Test pattern insertion evaluation in n x 600 19 2 48 kbps X 50 frame analysis Programmable A H bits 5 Hz to 3998 Hz 55 dBm0 to 3 dBm0 80 dBm0 to 5 dBm0 Test patterns 2E 1 2E 1 2E 1 2E 1 2E 1 2E 1 Alternating 1s and 0s All 1s All Os 8 and 16 bit programmable words Error injection Bit code FAS CRC errors Clocking G 703 transmit clock source 2048 kbps and co dir Internal external from RX Printer and remote operation Single ratio or frequency Interface V 24 DTE Async Baud rates 300 600 1200 2400 9600 19200 38400 Front panel Display 42 character x 16 line LCD with backlight LEDs 2 summary 14 alarm error option and low battery Keyboard Numeric keypad 4 cursor 2 contrast main menu 6 soft keys alt on and off Stores Memory 8 test configuration stores and 8 test results memories Self check Comprehensive self check at power on Languages English German French Spanish Italian Turkish and Portuguese Power Supply Internal supply Rechargeable NiCd batteries 8 to 10 hours operating time External supply External mains adapter charger Low battery warning LED before auto switch off Weight Dimensions Weight 1 55 kg approximately Dimensions h x d x w 72 x 136 x 195 mm O JDSU E Ordering information EST Silver Package BN4562 21 Includes
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