CERTIFICATE OF CONFORMITY
Contents
1. 10 SS T ere 10 3 2 Descriptions of Key Components and Operating 11 3 3 Description of Tested Supporting Unit and 13 34 Descoriphon ol Test es pp genset 14 2 Measurement 14 4 CONDUCTED DISTURBANCE MEASUREMENT 15 EGU POEN d 15 4 2 Block Diagram of Test SODUD dietro a 15 4 3 Limits for Conducted Emission Voltage EN 55022 Class 16 Mecum 16 d DOSE FC OE E IINE KM M cS 17 4 6 Conducted Disturbance Measurement 17 5 RADIATED DISTURBANCE MEASUREMENT eee eee eee eee eee eee o eee eee eee o ette eee neos 20 SX PM ES Fe E NER 20 2 2 Block Diagram ot 20 3 2c Latis Tor Adare Gi SUD AIM 22 34 Operatic ondion ob FUT ttd 22 2 9 TOSEDPOCSQUDG Loi ne eee Un 22 5 6 Radiated Disturbance Measurement 24 6 HARMONICS CURRENT MEASUREMENT eee eee eee ee eee oo ee eee eee o eee eese eese 29 TOSEBQUIDIBE aei a pU oem HIM 29 SAM2. 47 12 IMMUNITY TO CONDUCTED DISTURBANCES INDUCED BY FIELDS 49 IS LTOSPBEQUIDEIDICUE 49 122 BOCK Diagram of Test SetuP 49 12 3 Test Standard and Levels and Performance 49 12 4 Deviation From Test esses nana 50 12 5 50 17 TSE CS ES 50 13 POWER FREQUENCY MAGNETIC FIELD IMMUNITY TEST 52 13 TOSPEQqUIDIQC UE eee ne ee re ene oe eS nr tiet imt 52 13 2 Block Diagram of Test 52 13 3 Test Standard and Levels and Performance 52 135 4 Deviation From Test Standard cicesssiacsonitsvowseassccaniasacnneadvosaersiaetawesdesduichsanevnnsadsaddenttawiucesdaadsnesavensenst 52 1229 MES dre es aiU NETTE 53 MERE NENNT 53 14 VOLTAGE DIPS SHORT INTERRUPTIONS VOLTAGE VARIATIONS MM TES mc 55 55 14 2 Block Diagrami ot Test ME 55 14 3 Test Standard and Levels and Performance 55 14 4 Deviation From Test 2 2 55 Ido Tes DIOC COUN Co ocior III Tes UM TU IE RUNI IN AU SE
3. 1 10 Ye O0 by Client 4 LAN Cable 1 No Provided by LAB Note 1 Support Units B Power Cord Non Shielded Detachable 1 8m 2 Support Unit E AC Adapter DVE M N DSA 12G 12 FUS 120120 Power Cord Non Shielded Detachable 1 0m 3 Support Unit F AC Adapter Lenovo M N ADLX65NCT3A DC Power Cord Non Shielded Undetachable 1 8m Bonded a ferrite core AC Power Cord Non Shielded Detachable 1 0m 4 The support units E F are communicated partner system AUDIX Technology Corporation Report No EM E150125 AUDIX 3 4 Description of Test Facility Name of Firm Test Facility amp Location NVLAP Lab Code TAF Accreditation No 3 5 Measurement Uncertainty anu c 30MHz 1000MHz Distance 10m Radiation Test BM 1GHz 6GHz Distance 3m Uncertainty 3 5dB 5 3 4 84 80MHz 200MHz 1 7dB 200MHz 1000MHz 1 8dB 1GHz 6GHz 1 7dB Radiated Radio frequency Electromagnetic Field Test Remark Uncertainty ku y Page 14 of 69 AUDIX Technology Corporation EMC Department No 53 11 Dingfu Linkou Dist New Taipei City 244 Taiwan No 7 Shielded Room amp No 1 10m Semi Anechoic Chamber amp Immunity Test Site No 53 11 Dingfu Linkou Dist New Taipei City 244 Taiwan 200077 0 1724 AUDIX Technology Corporation Report No EM E150125 AUDIX Page 15 of 69 4 CONDUCTED DISTURBANCE MEASUREMENT 4 Test Equipment
4. 2014 10 04 2015 10 03 Schwarzbeck STLP 9128 E 9128E084 EX DN TESEQ C5982 10 98618 2014 08 13 2015 08 12 9 2 Block Diagram of Test Setup 9 2 1 Block Diagram of connection between and simulators same as Section 4 2 1 9 2 2 Test Setup Anechoic 3 Meters Chamber 1 55 Meter Control Direction Coupler Power Meter Room Power Amp Radiated Immunity System Personal Computer ABSORBER 0 8 Meter AUDIX Technology Corporation Report No EM E150125 AUDIX Page 40 of 69 9 3 Test Standard and Levels and Performance Criterion EN 55024 2010 EN 61000 4 3 2006 A 1 2008 A2 2010 IEC 61000 4 3 Ed 3 2 2010 Test Specification Test Level Performance Criteria Frequency Range 80 1000MHz Field Strength 3V m unmodulated r m s Modulation amp Signal 80 IKHz 9 4 Deviation From Test Standard 9 5 No deviation Test Procedure The field sensor 15 placed on the EUT table 0 8 meter above the ground which 15 3 meters away from the transmitting antenna Through the signal generator power amplifier and transmitting antenna to produce a uniformity field strength 3V m measured by field sensor around the EUT table from frequency range 80MHz 1000M Hz and records the signal generator s output level at the same time for whole measured frequency range Then put EUT and its simulators on the EUT turn table and keep them 3 meter away f
5. test It can be restored by operation of the controls by the user in accordance with the manufacturer s instructions after test AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 58 of 69 15 PHOTOGRAPHS 15 1 Photos of Conducted Disturbance Measurement FRONT VIEW OF CONDUCTED MEASUREMENT E 7 ie BACK VIEW OF CONDUCTED MEASUREMENT AUDIX Technology Corporation Report No EM E150125 Page 59 of 69 ZOOM IN VIEW OF EUT AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 60 of 69 15 2 Photos of Radiated Disturbance Measurement at Semi Anechoic Chamber 30 1000MHz T 1 u FRONT VIEW OF RADIATED EE 70 EN Ny Ban LIE MACRAE 5 Doc V 27 BACK VIEW OF RADIATED MEASUREMENT AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 61 of 69 15 3 Photo of Radiated Disturbance Measurement at Semi Anechoic Chamber o i quU m HEN n E AG 6 HR o FRONT VIEW OF RADIATED MEASUREMENT HHAH Se T J n BACK VIEW OF RADIATED MEASUREMENT AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 62 of 69 15 4 Photo of Harmonics Current Measureme
6. 2008 Test Specification Test Level Performance Criteria Contact Discharge 2kV and 4 Air Discharge 2kV 4 and 8kV AUDIX Technology Corporation Report No EM E150125 ZIUDIX J Page 37 of 69 8 4 Deviation From Test Standard Contact Discharge mode level up to 10 kV Air Discharge mode level up to 12kV 8 5 8 6 Test Procedure 8 5 1 8 5 2 8 5 3 8 5 4 8 5 5 Air Discharge This test is done on a non conductive surfaces The round discharge tip of the discharge electrode shall be approached as fast as possible to touch the EUT After each discharge the ESD generator discharge electrode shall be removed from the EUT The generator is then retrigged for a new single discharge and repeated 10 discharges each at positive and negative polarity for each preselected test point This procedure shall be repeated until all the air discharge completed Contact Discharge the procedure shall be same as 8 5 1 except that the tip of the discharge electrode shall touch the EUT conductive surfaces amp repeated 25 discharges each at positive and negative polarity for each test point before the discharge switch 1s operated Indirect discharge for horizontal coupling plane At least 25 discharges each at positive and negative polarity shall be applied to the horizontal coupling plane at points on each side of the EUT The ESD generator positions vertically at a distance of 0 1m from the EUT
7. 2016 03 03 onis 2015 0205 2016 02 08 6 Bilog Antenna TESEQ CBL6112D 33819 2014 04 19 2015 04 18 5 1 2 For Above Frequency At No 1 10m Semi Anechoic Chamber Model No 1 Spectrum Analyzer Agilent N9010A 526 MY51250943 2015 02 24 2016 02 23 2 Amplifier 8449B 3008A02681 2014 03 27 2015 03 26 EMCO 3117 00114403 2014 03 18 2015 03 17 5 2 Block Diagram of Test Setup 5 2 1 Block Diagram of connection between and simulators Same as Section 4 2 1 AUDIX Technology Corporation Report No EM E150125 AUDIX Page 21 of 69 5 2 2 Semi Anechoic Camber 10m Setup Diagram for 30 1000MHz ANTENNA TOWER ANTENNA ELEVATION VARIES FROM 1 TO 4 METERS PERIPHERALS TURN TABLE 10 METERS 0 8 METER GROUND PLANE TEST RECEIVER 5 2 3 Semi Anechoic Chamber 3m Setup Diagram for Above 1GHz ANTENNA TOWER D ANTENNA ELEVATION VARIES FROM 1 TO 4 METERS 3 METERS EUT PERIPHERALS ABSORBER 0 8 METER N N N N N TURN TABLE GROUND PLANE TEST RECEIVER AUDIX Technology Corporation Report No EM E150125 ZIUDIX J Page 22 of 69 5 3 Limits for Radiated Disturbance EN 55022 Class B 5 3 1 Limit below 1GHz Frequency Distance Quasi Peak Limits MHz Em dB 1 The tighter limit applies at the edge between two f
8. AC Power Port Page 48 of 69 Test Configuration Mode SKU 71 Location Polarity Phase Angle 0 90 180 270 Pulse Voltage 0 5 0 5 Results amp Criterion AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 49 of 69 12 IMMUNITY TO CONDUCTED DISTURBANCES INDUCED BY RF FIELDS 12 1 Test Equipment Model No Cal Due TESEQ NSG4070B 30 035076 2014 11 05 2015 11 04 2 6 Attenuator TESEQ ATN 6050 38424 2015 03 09 2016 03 08 TESEQ CDN M016 34607 2014 11 05 2015 11 04 12 2 Block Diagram of Test Setup 12 2 1 Block Diagram of connection between EUT and simulators Same as Section 4 2 1 12 2 2 Common Mode Test Setup Ground Reference support 12 3 Test Standard and Levels and Performance Criterion EN 55024 2010 EN 61000 4 6 2014 IEC 61000 4 6 Ed 4 0 2013 Test Specification Test Level Signal and telecommunication ports AC Input and Output Power Ports Attenuator requency Range 0 15 80MHz ield Strength 3V unmodulated r m s A Moni OM ANIA AUDIX Technology Corporation Report No EM E150125 ZIUDIX J Page 50 of 69 12 4 Deviation From Test Standard No deviation 12 5 Test Procedure 12 5 1 12 9 12 5 3 12 5 4 12 5 5 12 5 6 12 25 Set up the EUT CDN and test generators as shown on section 12 2 The EUT and supporting equipment were placed on an insulating
9. Block Diagram OF Test SEMP E 29 SE UIA A e a RETO ETE 29 64 Deviation From Test SEI HEC 29 6 5 Limit for Harmonics Current Class D 30 56 5 Operatns Condon oL BELT 30 6 1 SEC UR eene ibtd toten ap edem beet 30 TISSERESUS uso A rer frre 30 7 VOLTAGE FLUCTUATION AND FLICKER MEASUREMENT ee eee eeeeee 33 WM Test UMM Oates mm 33 7 2 ducunt 33 Tor SE CC MERC m 33 722 Deviation From Test ment 33 7 5 Limit for Voltage Fluctuation and 34 76 Operatme Condinon or BUT 34 MGSO te COC SIG 34 due UU S 34 8 ELECTROSTATIC DISCHARGE IMMUNITY 5 21 4 lt 36 SI 36 8 2 36 8 3 Test Standard and Levels and Performance 36 8 4 Deviation From Test Standard AUDIX Technology Corporation Report No 150125 AUDIX Page 4 of 69 Test POC CCS 37 ES dS 37 9 RADIATED RADIO
10. Discharge gt gt gt 2 2 4 4 8 8 10 10 12 12 Comments A A AA A 5 0 J J J X 2 N 5 A A A A J y j Voltage kV Level Discharge per polarity 25 Result Test Location 22 2 4 4 6 6 48 8 9 9 10 10 Comments Note 2 Indirect Contact Test Location VCP Front VCP Right VCP Left VCP Back A gt gt gt gt gt HCP Bottom A A A Additional Notes Please refer to the Photos of ESD Test Points Measurement Points ND No Discharge Meets criteria but unable to obtain an electrostatic discharge ESD at this test point Note Due to the EUT has no conductive surface It s not necessary to test contact discharge AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 39 of 69 9 RADIATED RADIO FREQUENCY ELECTROMAGNETIC FIELD IMMUNITY TEST 9 1 Test Equipment Model No B Immunity TESEO ITS 6006 033009 2014 10 01 2015 09 30 2 Power Amplifier TESEQ 10 275 1744214 D power veer TESEQ PM 6006 073365
11. Function the same time WLAN Function To transmit Data transfer to partner Notebook PC BT Function To transfer BT signal to Bluetooth mouse Card reader Read Write operation to memory card The other peripheral devices were driven and operated in turn during all testing AUDIX Technology Corporation Report No EM E150125 AUDIX Page 17 of 69 4 5 4 6 Test Procedure The EUT was put on table which was above the ground by 80cm and AC adapter s power cord was connected to the AC mains through an Artificial Mains Network AMN The other peripheral devices power cord connected to the power mains through a line impedance stabilization network LISN This provided a 500 coupling impedance for the tested equipment Both sides of AC line were checked to find out the maximum conducted emission according to EN 55022 regulations during conducted emission measurement The bandwidth of the R amp S Test Receiver ESCI was set at 9kHz The frequency range from 0 15MHz to 30MHz was pre scanned with a peak detector All the final readings from Test Receiver were measured with the Quasi Peak detector and Average detector Remark If the Average limit 15 met when using a Quasi Peak detector the Average detector 1s unnecessary Conducted Disturbance Measurement Results PASSED All emissions not reported below are too low against the prescribed limits The EUT with the worst test mode SKU 1 was measured and the test results are l
12. Report No EM E150125 AUDIX j Page 45 of 69 Electrical Fast Transient Burst Immunity Test Results AUDIX TECHNOLOGY CORPORATION Applicant INTEL CORP Test Date 2015 03 09 EUT Intel Compute Stick Temperature 20 Test Model STCK1A32WFC Power Supply 230V 50Hz Via AC Adapter Humidity 55 Working Condition See section 4 4 Test Configuration Mode SKU 71 Engineer Jason Chen Inject Place AC Main Power Supply Port Inject Line Test Voltage Inject Time Inject Method Results amp Criterion 0 5 1kV 60s Direct 0 5 1kV 60s Direct L1 L2 0 5kV 1kV 60s Direct AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 46 of 69 11 SURGE IMMUNITY TEST 11 1 Test Equipment Model No E103 9506267 Surge Coupler Thermo E4551 1003195 2015 02 24 2016 02 23 Decoupler 501 1003193 2015 02 24 2016 02 23 11 2 Block Diagram of Test Setup 11 2 1 Block Diagram of connection between EUT and simulators same as Section 4 2 1 11 2 2 Test Setup AC Line Test Generator 80cm gt To AC Power Supply Network Ground Plane Grounding Plate Remark Test generator includes control center surge combination and coupler 1 1 3 Test Standard and Levels and Performance Criterion EN 55024 2010 EN 61000 4 5 TEC 61000 4 5 Ed 2 0 2005 Test Specification Test Level Telecommunication
13. The following test equipment was used during the conducted disturbance measurement No 7 Shielded Room Model No Cal Due ESCI 101276 2014 04 14 2015 04 13 ESH2 Z5 100366 2014 03 11 2015 03 10 3 LISN KNW 407 8 1539 3 2015 01 22 2016 01 21 ESH3 Z2 101495 2015 01 17 2016 01 16 4 2 Block Diagram of Test Setup 4 2 1 Block Diagram of connection between EUT and simulators USB KEYBOARD A LCD MONITOR B MEMORY CARD C AC ADAPTER Y AC POWER BT MOUSE D SOURCE Partner System WIRELESS ROUTER E NOTEBOOK PC F AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 16 of 69 4 2 2 Shielded Room Setup Diagram gt EUT Peripherals 40cm 80cm Table 80 Table Ground Plane 4 3 Limits for Conducted Emission Voltage EN 55022 Class B Maximum RF Line Voltage dB uV Frequency Range i Quasi Peak Level Average Level 0 15MHz 0 5MHz Remark 1 If average limit is met when using a Quasi Peak detector the EUT shall be deemed to meet both limits and measurement with the average detector is unnecessary 2 The lower limit applies at the band edges 4 4 Operating Condition of EUT EUT Exercise Program and Condition Operating System Windows 8 1 Test Program EMC Test Display scrolling H pattern with respective resolution at hic Functi Graphic
14. dimension of the line tangent to EUT formed by 03dB at the measurement distance d Equation 10 shall be used to calculate w for each actual antenna and measurement distance used The values of w hall be included in the test report This calculation may be based on the manufacturer provided receive antenna beamwidth specifications w 2 tan 0 5 x03dB 3l Frequency The values of w are greater than chapter 7 6 6 1 of Table 3 the minimum dimension of w Wmin requirements AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 24 of 69 5 6 Radiated Disturbance Measurement Results PASSED All emissions not reported below are too low against the prescribed limits For 30M Hz 1000MHz frequency range The EUT with the worst test mode SKU 1 was measured and the test results are listed 1n section 5 6 1 EUT Intel Compute Stick Test Model STCK 1A32WFC Test Date 2015 03 13 Temperature 19 Humidity 52 The details of test mode are as follows Reference Test Data No Configuration Mode For Above 1GHz frequency range The EUT with the worst test mode SKU 1 was measured and the test results are listed 1n section 5 6 2 EUT Intel Compute Stick Test Model STCK1A32WFC Test Date 2015 03 13 Temperature 19 C Humidity 52 The details of test mode are as follows Reference Test Data No Configuration Mode AUDIX Technology Corporation Report N
15. j Page 35 of 69 Flicker Test Summary per EN IEC61000 3 3 Run time EUT STCK1A32WFC Tested by Yan Test category dt dmax dc and Pst European limits Test Margin 100 Test date 2015 3 11 Test duration min 10 Data file name F 000500 cts data Comment SKU 1 Test Result Pass Status Test Completed Pst and limit line European Limits 1 00 0 75 0 50 0 25 55 25 01 Pit and limit line 3 00 2 PIt e 2 2 50 So rs Ol Parameter values recorded during the test Vrms at the end of test 230 04 Highest dt 0 00 Test limit 3 30 8 gt dt 0 Test limit mS 300 0 Pass Highest dc 0 00 Test limit pis 3 30 Pass Highest dmax 40 0 00 Test limit 75 4 00 Pass Highest Pst 10 min period 0 064 Test limit 1 000 Pass AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 36 of 69 8 ELECTROSTATIC DISCHARGE IMMUNITY TEST 8 1 Test Equipment Model No 1 ESD Simulator EM TEST dito 0503100055 2014 04 21 2015 04 20 8 2 Block Diagram of Test Setup 8 2 1 Block Diagram of connection between EUT and simulators Same as Section 4 2 1 8 2 2 Test Setup Vertical plate Horizontal plate Insulation 470kohm 470kohm 470kohm 470kohm Ground Plane 8 3 Test Standard and Levels and Performance Criterion EN 55024 2010 EN 61000 4 2 2009 61000 4 2 Ed 2 0
16. ports input and output power ports line to line line to earth AUDIX Technology Corporation Report No EM E150125 AUDIX Page 47 of 69 11 4 Deviation From Test Standard No deviation 11 5 Test Procedure 11 5 1 Set up the EUT and test generator as shown on section 11 2 11 5 2 For line to line coupling mode provided a 0 5 1kV 1 2 50 us current surge at open circuit condition and 8 20 us current surge to EUT selected points 11 5 3 At least 5 positive and 5 negative polarity tests with a maximum 1 pulse min repetition rate were conducted during test 11 5 4 Different phase angles were done individually 11 5 5 Repeat procedure 11 5 2 to 11 5 4 except the open circuit test voltages 0 5kV 1kV 2kV for line to earth coupling mode test 11 5 6 Record the EUT operating situation during compliance test and decide the EUT immunity criterion for above each test 11 6 Test Results PASSED Complied with Criterion The EUT with the worst test mode SKU 1 was measured and the test results are listed next page AUDIX Technology Corporation Report No EM E150125 surge Immunity Test Results AUDIX TECHNOLOGY CORPORATION Applicant INTEL CORP EUT Intel Compute Stick Test Model STCK1A32WFC Test Date 2015 03 09 Temperature 20 Power Supply AC 230V 50Hz Via AC Adapter Humidity 55 Working Condition See section 4 4 Engineer Jason Chen Input And Output
17. support 0 1m high above a ground reference plane CDN coupling and decoupling device was placed on the ground plane making contact with it at about 0 1 0 3m from EUT Cables between CDN and EUT were as short as possible The disturbance signal described below was injected to EUT through CDN The EUT operates within its operational mode s under intended climatic conditions after power on The frequency range was swept from 0 15 to 80MHz using signal level and with the disturbance signal 80 amplitude modulated with a 1kHz sine wave The rate of sweep shall not exceed 1 5 10 3decades s Where the frequency was swept incrementally the step size shall not exceed 1 of the start and thereafter 19o of the preceding frequency value Recording the EUT operating situation during compliance testing and decide the EUT immunity criterion 12 6 Test Results PASSED Complied with Criterion A The EUT with the worst test mode SKU 1 was measured and the test results are listed next page AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 51 of 69 Immunity to Conducted Disturbances Induced by RF Fields Test Results AUDIX TECHNOLOGY CORPORATION Applicant INTEL CORP Test Date 2015 03 16 EUT Intel Compute Stick Temperature 20 C Test Model STCK1A32WFC Power Supply AC 230V 50Hz Via AC Adapter Humidity 52 Working Condition See section 4 4 Test Configuration Mode SKU 1 Enginee
18. 1 64 24 14 43 QP 3 0 279 90 19 0 03 9 86 21 75 31 83 50 85 19 62 Average 4 6 279 86 19 0 03 9 86 34 82 44 90 60 85 15 95 QP 5 60 381 90 19 0 03 9 86 21 74 31 82 48 25 16 43 Average 6 0 381 980 19 0 03 9 86 31 23 41 31 58 25 16 94 QP 7 0 507 9 20 0 03 9 87 17 36 27 46 46 00 18 54 Average 8 0 507 9 20 0 03 9 87 27 72 37 82 56 00 18 18 QP 9 1 680 0 23 0 06 9 86 15 32 25 47 46 00 20 53 Average 18 1 686 980 23 0 06 9 86 22 31 32 46 56 00 23 54 QP 11 10 564 6 45 0 14 9 96 13 35 23 84 50 00 26 16 12 16 564 0 45 0 14 9 96 22 37 32 86 60 00 27 14 QP Remarks 1 Emission Level AMN Factor Cable Loss Pulse Att Reading 2 If the average limit is met when useing a quasi peak detector the EUT shall be deemed to meet both limits and measurement with average detector is unnecessary AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 20 of 69 5 RADIATED DISTURBANCE MEASUREMENT 5 1 Test Equipment The following test equipment was used during the radiated disturbance measurement 5 1 1 For 30MHz 1000MHz Frequency At No 1 10m Semi Anechoic Chamber Item Type Manufacturer Model No Serial No Cal Date Cal Due 1 Spectrum Analyzer Agilent N9010A 503 MY52220119 2014 12 23 2015 12 22 2 Spectrum Analyzer _ Agilent 9010 503 MY51250850 2015 03 05 2016 03 04 3 _flestReveiver__ R amp S ESCT 1092 3014 05 06 2015 05 05 Amplifier Sonoma 310N 187158 2015 03 04
19. 1000 4 2 Ed 2 0 2008 oA pass 61000 4 3 2006 1 2008 2 2010 PASS 5 IEC 61000 4 3 Ed 3 2 2010 61000 4 4 2012 Electrical fast transient burst IEC 61000 4 4 Ed 3 0 2012 A pass Surge Input a c power ports EN 61000 4 5 2006 B A PASS Surge Telecommunication ports IEC 61000 4 5 Ed 2 0 2005 B NA NA Immunity to conducted 61000 4 6 2014 disturbances induced by IEC 61000 4 6 Ed 4 0 2013 A A PASS radio frequency fields 61000 4 8 2010 Power frequency magnetic field 61000 4 8 Ed 2 0 2009 Voltage dips gt 95 reduction B A PASS EN 61000 4 11 2004 61000 4 11 Ed 2 0 2004 Voltage dips 30 reduction Voltage interruptions N A 1s an abbreviation for Not Applicable AUDIX Technology Corporation Report No EM E150125 AUDIX Page 9 of 69 2 2 Description of Performance Criteria General Performance Criteria Examples of functions defined by the manufacturer to be evaluated during testing include but are not limited to the following essential operational modes and states tests of all peripheral access hard disks floppy disks printers keyboard mouse etc quality of software execution quality of data display and transmission quality of speech transmission 2 2 1 Performance criterion A During and after the test the EUT shall continue to operate as intended without opera
20. 2 980 23 0 04 9 85 18 56 28 62 56 00 27 38 QP 9 2 567 90 28 0 07 9 85 8 31 18 51 46 00 27 49 Average 18 2 567 8 28 0 07 9 85 16 58 26 78 56 00 29 22 11 11 198 9 52 0 15 9 91 18 47 21 05 50 00 28 95 12 11 198 6 52 0 15 9 91 19 00 29 58 60 00 30 42 QP Remarks 1 Emission Level AMN Factor Cable Loss Pulse Att Reading 2 If the average limit is met when useing a quasi peak detector the EUT shall be deemed to meet both limits and measurement with average detector is unnecessary AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 19 of 69 AUDIX TECHNOLOGY Corp EMC Department AW DIX No 53 11 Dingfu Linkou Dist New Taipei City 244 Taiwan Tel 4886 2 26092133 886 2 26099303 Email emc audixtech com Data 27 File D test datalkREPORT 20151C 1M1503XXX1IC1M1503003 C D EM6 30 go Level dBuV Date 2015 03 04 70 60 EN55022 CLASS B E heiss CLASS B AV 40 30 20 10 00 15 0 5 1 2 5 10 20 30 Frequency MHz Site no No 7 Shielded Room Data no 27 Condition ESH2 Z5 366 Phase LINE Limit EN55022 CLASS B Env Ins 21 C 62 ESCI 1276 Engineer EUT STCK1A32WFC Power Rating 230Vac 50Hz Test Mode SKU 1 AMN Cable Pulse Emission Freq Factor Loss Att Reading Level Limits Margin Remark MHz dB dB dBuv dBuv dB 1 6 185 8 18 0 03 9 85 27 66 37 72 54 24 16 52 Average 2 6 185 8 18 0 03 9 85 39 75 49 8
21. 50125 AUDIX Page 6 of 69 EMC TEST REPORT Applicant INTEL CORP EUT Description Intel Compute Stick A Test Model STCKIA32WFC B Family Product Code xSTCKIxFCx Where x may be a combination of alphanumeric characters or blank C Serial Number N A D Brand Name Intel E Power Supply DCSV 2A F Test Voltage AC 230V 50Hz Via AC Adapter Measurement Standard Used EN 55022 2010 2011 Class EN 61000 3 2 2014 and EN 61000 3 3 2013 EN 55024 2010 EN 61000 4 2 2009 IEC 61000 4 2 Ed 2 0 2008 EN 61000 4 3 2006 A1 2008 A2 2010 61000 4 3 Ed 3 2 2010 EN 61000 4 4 2012 IEC 61000 4 4 Ed 3 0 2012 EN 61000 4 5 2006 IEC 61000 4 5 Ed 2 0 2005 EN 61000 4 6 2014 IEC 61000 4 6 Ed 4 0 2013 EN 61000 4 8 2010 IEC 61000 4 8 Ed 2 0 2009 EN 61000 4 11 2004 IEC 61000 4 11 Ed 2 0 2004 The device described above was tested by AUDIX Technology Corporation to determine the maximum emission levels emanating from the device its ensured severity levels and performance criterion This test report contains the measurement results and AUDIX Technology Corporation assumes full responsibility for the accuracy and completeness of these measurements Also this report shows that the EUT 15 technically compliant with the requirements of EN 55022 EN 61000 3 2 EN 61000 3 3 and EN 55024 standards This report applies to above tested sample only and shall not be reproduced in part without writte
22. Antenna 2 95dBi Technology Inc AC Input Asian Power WB 10GO5R 100 240V 50 60Hz 0 4A Max Device Inc Wall mount 2C Micro USB Cable Shielded Detachable 1 0m HDMI Cable Shielded Detachable 0 2m Remark For a more detailed features description please refer to the manufacturer s specifications or the user manual Wi Fi BT Combo Module AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 12 of 69 3 2 2 List of operating modes under test SKU 1 14 Mother Board Intel STCK1A32WFC IS CPU Intel Z3735F V HYNIX H5TC4G63AFR PBA SAMSUNG KLMBGA4GEND B031 V eMMC TOSHIBA THGBMBG8D4KBAI KINGSTON EMMC32G S100 WB9 Wi Fi BT Combo Module REALTEK RTL8723BS v 1920 1200 sori sabi 200 Fo v v v 192071080 sori 200 Fon vf 16001200 sai 150 Fon Sie V Resolution 1400 1050 60Hz 32bit 150 Font Size V Cable Test Voltage fac 120v TT AC Adapter Asian WB 10G05R LLL LL LL LIVE LLLLLIV NEN LI pt tt ivy AC 110V 60Hz VIVIVIVIVIVIVIVIV V 128071024 75H17 Sabi 125 Font Sal 10247768 758 328 100 Fon Size s00 600 7st sai 10 Font Size EE Acme enz __ acmosu ET EET 3 2 3 According to radiated emission pre test result the EUT collocates with following worst components SKU 1 which are used
23. Conditioning CCN 1000 3 1234403680 2014 01 17 2016 01 16 3 Three Phase TESEQ INA2197 1234403681 2014 01 17 2016 01 16 Impedance Network TESEQ NSG 2200 3 22713 2014 01 17 2016 01 16 Switching Unit 7 2 Block Diagram of Test Setup 7 2 1 Block Diagram of connection between EUT and simulators same as Section 4 2 1 7 2 2 Test Setup Three Phase Impedance Network 80cm TABLE To AC Power Supply Network Ground Plane 7 3 Test Standard EN 61000 3 3 2013 7 4 Deviation From Test Standard No deviation AUDIX Technology Corporation Report No EM E150125 AUDIX Page 34 of 69 dao 7 6 7 7 7 8 Limit for Voltage Fluctuation and Flicker Operating Condition of EUT Same as conducted emission measurement which 1s listed in 4 4 except the test set up replaced by section 7 2 Test Procedure Apply a 230V 50Hz rated test voltage which shall be maintained within 2 0 and the frequency within 39 596 of the nominal value to Test Results PASSED The EUT with the worst test mode SKU 1 was measured and the test results are listed next page Remark Due to the maximum r m s input current including inrush current does not exceed 20A and the supply current after inrush is within a variation band of 1 5A it s not applicable to test the manual switching AUDIX Technology Corporation Report No EM E150125 AUDIX
24. FREQUENCY ELECTROMAGNETIC FIELD IMMUNITY 39 Sle 39 92 Block Diagranrof Test S6 39 9 3 Test Standard and Levels and Performance 04 00000 40 9 4 Deviation From Test 40 RS PSU uio eset 40 4 10 ELECTRICAL FAST TRANSIENT BURST IMMUNITY TEST 43 IO I Test Equipment 43 10 2 Block Diagram ot Test Sell 43 10 3 Test Standard and Levels and Performance 43 10 4 Deviation From Test 2 43 TOSE 601 ooo 44 CUR AE E CSS sprang 44 11 SURGE IMMUNITY TES 46 gs NSS I ei ELS M NR 46 IB Bur EMI e I 46 11 3 Test Standard and Levels and Performance 46 11 4 Deviation From Test Standard ba EYE Uo Nee SERM Dis 47 I 47 LOSE
25. MEASUREMENT 6 1 Test Equipment Model No 1 Power Source TESEQ NSG 1007 45 1248404038 2014 01 17 2016 01 16 MM Conditioning CCN 1000 3 1234403680 2014 01 17 2016 01 16 3 Three Phase TESEQ INA2197 1234403681 2014 01 17 2016 01 16 Impedance Network 4 TESEQ NSG2200 3 22713 2014 01 17 2016 01 16 Switching Unit 6 2 Block Diagram of Test Setup 6 2 1 Block Diagram of connection between EUT and simulators Same as Section 4 2 1 6 2 2 Test Setup AC Line Three EUT Impedance Network TABLE To AC Power Supply Network Ground Plane 80 6 3 Test Standard EN 61000 3 2 2014 6 4 Deviation From Test Standard No deviation AUDIX Technology Corporation Report No EM E150125 AUDIX Page 30 of 69 6 5 6 6 6 7 6 8 Limit for Harmonics Current Class D Equipment Harmonic order Maximum permissible Maximum permissible harmonic current per watt mA W harmonic current A Odd Harmonics Only 2 30 1 14 0 77 0 40 0 33 13 0 21 15 lt lt 39 0 15x15 n No limits apply for equipment with an active input power up to and including 75W Operating Condition of EUT Same as conducted emission measurement which 15 listed in 4 4 except the test set up replaced by section 6 2 Test Procedure 6 7 1 Apply a 230V 50Hz rated test voltage which shall be maintained within 0 0 and the frequency wi
26. Page 1 of 69 r z ZI8 B EQ CERTIFICATE OF CONFORMITY For the following information Ref File No C1M1503003 Product Intel Compute Stick Test Model STCK1A32WFC Family Product Code xSTCK1xFCx Where x may be a combination of alphanumeric characters or blank Brand Name Intel Applicant INTEL CORP Test Report Number EM E150125 Standards EN 55022 2010 AC 2011 Class B EN 61000 3 2 2014 and EN 61000 3 3 2008 EN 55024 2010 EN 61000 4 2 2009 IEC 61000 4 2 Ed 2 0 2008 EN 61000 4 3 2006 1 2008 2 2010 IEC 61000 4 3 Ed 3 2 2010 EN 61000 4 4 2012 IEC 61000 4 4 Ed 3 0 2012 EN 61000 4 5 2006 IEC 61000 4 5 Ed 2 0 2005 EN 61000 4 6 2014 IEC 61000 4 6 Ed 4 0 2013 EN 61000 4 8 2010 IEC 61000 4 8 Ed 2 0 2009 EN 61000 4 11 2004 IEC 61000 4 11 Ed 2 0 2004 We hereby certify that the above product has been tested by us with the listed standards and found in compliance with the council EMC directive 2004 108 EC The test data and results are issued on the EMC test report no EM E150125 NY UA NVLAP Lab Code 200077 0 Signature Allen Wang Assistant General Maf Date 2015 03 17 Test Laboratory AUDIX Technology Corporation EMC Department S NVLAP Lab Code 200077 0 Hac MRA TAF Accreditation No 1724 LE FCC OET Designation TW1004 1724 Web Site www audixtech com The statement is based on a single evaluation of one sample of the above ment
27. S UPr DU IIR EUSEUE 56 R So Eom Ebo DRIN I PISO eM DIU NE 56 I5 PHOTOGRAPHS girre ne ai n Tei 58 15 1 Photos of Conducted Disturbance 58 15 2 Photos of Radiated Disturbance Measurement at Semi Anechoic Chamber 30 1000 2 60 15 3 Photo of Radiated Disturbance Measurement at Semi Anechoic Chamber Above 1GHZ 61 15 4 Photo of Harmonics Current 62 15 5 Photo of Voltage Fluctuation and Flicks 62 15 6 Photos of Electrostatic Discharge Immunity 63 15 7 Photos of Radiated Radio Frequency Electromagnetic Field Immunity Test 66 15 8 Photos of Electrical Fast Transient Burst Immunity 67 AUDIX Technology Corporation Report No EM E150125 AUDIX Page 5 of 69 15 9 Photo of Surge Immunity 1 67 15 10 Photos of Immunity to Conducted Disturbances Induced by RF Fields 68 15 11 Photo of Power Frequency Magnetic Field Immunity 68 15 12 Photo of Voltage Dips Short Interruptions Voltage Variations Immunity 69 APPENDIX Photos of EUT AUDIX Technology Corporation Report No EM E1
28. and with the discharge electrode touching the coupling plane Indirect discharge for vertical coupling plane At least 25 discharges each at positive and negative polarity shall be applied to the center of one vertical edge of the coupling plane The coupling plane of dimensions 0 5m x 0 5m 1s placed parallel to and positioned at a distance of 0 1m from the EUT Discharges shall be applied to the coupling plane with this plane in sufficient different positions that the four faces of the EUT are completely illuminated For above tests the voltage was increased from the minimum to the selected test level Test Results PASSED Complied with Criterion The EUT with the worst test mode SKU 1 was measured and the test results are listed next page AUDIX Technology Corporation Report No EM E150125 ZIUDIX J Page 38 of 69 Electrostatic Discharge Immunity Test Results AUDIX TECHNOLOGY CORPORATION Applicant INTEL CORP EUT Intel Compute Stick Test Model STCK1A32WFC Power Supply AC 230V 50Hz Via AC Adapter Working Condition See section 4 4 Engineer Jacky Chen Test Date 2015 03 12 Atmospheric Pressure 99kPa Temperature 20 Humidity 50 Test Configuration Mode SKU 71 Air Discharge Voltage kV Level Discharge per polarity 10 Result Test Location HDMI 1 DC IN 2 USB 3 SD Card Slot 4 LED 5 Button 6 Hole 4 7 10 Seam 7 11 17 Contact
29. chnology Corporation Report No EM E150125 ZIUDIX J AUDIX TECHNOLOGY Corp EMC Department AU DIX No 53 11 Dingfu Linkou Dist New Taipei City 244 Taiwan Tel 4886 2 26092133 886 2 26099303 Email emc audixtech com Data 3 File DITEST DATAIREPORT 2015 C1M1503 XX X1C1M15030031C1M1503003 1G EM6 10 429 dBuV m Date 2015 03 13 110 90 CLASS TO CLASS B AV 50 30 10 01000 2000 3000 4000 5000 6000 Frequency MHz Site no NO 1 Chamber Data no 3 Dis Z Amt om 3117 14403 nt pol VERTICAL Limit CLASS Env Ing 19C 52 Engineer SICKIASZWEC Power Rating 230Vac 50Hz Test Mode nt Cable Preamp Emission Freg Factor Loss Gain Reading Level Limits Margin Remark MHz dB m dB dB dBuWV m dBuV m dB 1 1020 21 27 71 1 76 221 AO 04 43 22 50 00 6 78 Average 1020 21 ZF stl 1 79 36 5 n4 15 AT 70 00 28 67 Peak 3 1240 22 27 54 2 08 35 90 47 45 41 48 50 00 6 52 Average 4 1340 25 27 84 2 09 3 00 51 18 2 70 00 4 79 Peak p 1TIDST 29 50 2 50 35 61 42 06 922 50 00 10 78 Average 0 1710 37 29 55 Peal 35 61 47 90 44 14 70 00 25 86 Peak Remarks 1 Emission Level Antenna Factor Cable Loss Reading Preamp 2 emission levels that are 20dB below the official limit are not reported Page 28 of 69 AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 29 of 69 6 HARMONICS CURRENT
30. en antenna was in vertical polarization 2 0m height and turn table was at 260 4 Degree is calculated from 0 clockwise facing the antenna AUDIX Technology Corporation Report No EM E150125 AUDIX Page 27 of 69 5 6 2 Radiated Disturbance Measurement Results at Semi Anechoic Camber Above 1GHz AUDIX Data 4 120 110 90 70 50 30 10 000 Site no Dis dnt Limit Env Ins EUT Power Rating Test Mode Freq MHz AUDIX TECHNOLOGY Corp EMC Department No 53 11 Dingfu Linkou Dist New Taipei City 244 Taiwan R O C Tel 4886 2 26092133 Fax 886 2 26099303 Email emc jaudixtech com File DATEST DATAIREPORT 20151C1M1503XXXYC 1M15030031C 1M1503003 1G EM6 10 Level dBuV m 2000 NO 1 Chamber am 5117 14403 CLASS E PK Db 50 SICKIASZWPC 230Tac 50Hz SAURI Date 2015 03 13 CLASS B PK CLASS B AV 3000 4000 5000 6000 Frequency MHz Data no 4 Ant pol HORIZONTAL Engineer TIM Emission Level Limits Margin Eemark dBu Vm dB 1 1005 21 1005 21 3 1590 36 4 1390 36 1730 36 5 1730 36 39 53 50 00 10 47 Average 43 80 70 00 26 20 Peak Slc ar 50 00 11 49 Average 41 63 70 00 20 97 Peak 33 18 50 00 11 84 verage AQ 24 70 00 29 76 Peak Remarks 1 Emigsion Level Antenna Factor Cable Loss Reading Preamp 2 lhe emission levels that are 2 dB below the official limit are not reported AUDIX Te
31. ioned products It does not imply an assessment of the whole production and does not permit the use of the test lab logo Page 2 of 69 EMC TEST REPORT for INTEL CORP Intel Compute Stick Test Model STCK1A32WFC Family Product Code xSTCK1xFCx Where x may be a combination of alphanumeric characters or blank Brand Intel Prepared for INTEL CORP HF3 96 5200 NE ELAM YOUNG PKY HILLSBORO OR 97124 USA Prepared by AUDIX Technology Corporation EMC Department No 53 11 Dingfu Linkou Dist New Taipei City 244 Taiwan Tel 02 2609 9301 2609 2133 Fax 02 2609 9303 File Number C1M1503003 Report Number 150125 Date of Test 2015 03 04 16 Date of Report 2015 03 17 AUDIX Technology Corporation Report No EM E150125 AUDIX Page 3 of 69 TABLE OF CONTENTS Description Page EMCI og a a ee ee ee ee 6 L DESCRIPTION OF VERSION sscscicccecucerccesestusteveseuccvsssssncecesenccsusstustsceseeusiesieesssentenpavecsenstenses 7 2 SUMMARY OF STANDARDS AND 5 8 2 15 Description or standards and 8 2 2 Description of Performance Criteria iecore ea tamus antt a das visent deme 9 S GENERAL INFORMATION OPE
32. isted next pages EUT Intel Compute Stick Test Model STCK1A32WFC Test Date 2015 03 04 Temperature 21 C Humidity 62 The details of test mode are as follows Reference Test Data No Configuration Mode AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 18 of 69 AUDIX TECHNOLOGY Corp EMC Department AU DIX No 53 11 Dingfu Linkou Dist New Taipei City 244 Taiwan Tel 4886 2 26092133 886 2 26099303 Email emc audixtech com Data 28 File D itest datalREPORT 2015 C 1M1503XXX1C 1M1503003 C D EM6 30 go Leve dBuV Date 2015 03 04 TO 60 EN55022 CLASS B CLASS 40 30 20 10 05 15 0 5 1 2 5 10 20 30 Frequency MHz Site no No 7 Shielded Room Data no 28 Condition ESH2 Z5 366 Phase NEUTRAL Limit EN55022 CLASS B Env Ins 21 C 62 ESCI 1276 Engineer EUT STCK1A32WFC Power Rating 230Vac 50Hz Test Mode SKU 1 AMN Cable Pulse Emission Freq Factor Loss Att Reading Level Limits Margin Remark MHz dB dB dBuv dBuv dB 1 6 182 90 21 0 03 9 85 28 64 38 73 54 42 15 69 Average 2 6 182 9 21 0 03 9 85 40 64 58 73 64 42 13 69 QP 3 0 313 9 22 0 03 9 86 25 76 35 87 49 88 14 01 Average 4 0 313 9 2 0 03 9 86 34 86 44 97 59 88 14 91 5 6 398 06 23 0 03 9 86 19 00 29 12 47 90 18 78 Average 6 6 398 0 23 0 03 9 86 30 34 40 46 57 90 17 44 QP 7 1 082 90 23 0 04 9 85 18 23 20 35 46 00 25 65 Average 8 1 08
33. limits Source qualification Normal POHC A 0 000 Harmi Harms avg 100 Limit sof Limit Note The EUT power level is below 75 0 Watts and therefore has no defined limits 0 000 0 011 0 000 0 011 0 000 0 012 0 007 0 003 0 002 0 001 0 001 0 001 0 001 0 001 0 001 0 001 0 001 0 000 0 000 0 000 0 000 0 000 0 000 0 000 N A Current Test Result Summary Run time Tested by 5am Yan Test Margin 100 POHC Limit A 0 000 Harms max 0 010 0 010 0 010 0 003 0 003 0 008 0 008 0 007 0 006 0 006 0 005 0 000 0 000 0 000 0 000 0 000 0 000 0 000 0 000 ency Hz 50 00 Amps Crest Factor Power Factor 0 053 f 867 0 366 1350 Limit 0 018 0 010 0 005 0 003 0 002 0 002 0 001 0 001 0 001 0 001 0 001 0 001 0 001 0 001 0 001 0 001 0 001 0 001 0 001 Page 32 of 69 Limit Status N A N A N A N A N A N A N A N A N A N A N A N A N A N A N A N A N A N A N A AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 33 of 69 7 VOLTAGE FLUCTUATION AND FLICKER MEASUREMENT 7 1 Test Equipment Model No 1 Power Source TESEQ NSG 1007 45 1248404038 2014 01 17 2016 01 16 MM
34. m 30MHz to 1000MHz was checked with Peak detector and all final readings of measurement were with Quasi Peak detector at Semi Anechoic Chamber AUDIX Technology Corporation Report No EM E150125 ZIUDIX J Page 23 of 69 5 5 2 For Frequency Range Above which was measuring at Semi Anechoic Chamber The EUT and its simulators were placed on a turn table which was 0 8 meter above ground The portion of the test volume that was obstructed by absorber placed on the floor 30cm maximum The turn table rotated 360 degrees to determine the position of the maximum emission level EUT was set 3 meters away from the receiving antenna which was mounted on an antenna tower The antenna moved up and down between 1 to 4 meters to find out the maximum emission level calibrated Horn Antenna was used as a receiving antenna Both horizontal and vertical polarization of the antenna was set on measurement and both average and peak emission level were recorded form spectrum analyzer In order to find the maximum emission level all the interface cables were manipulated according to EN 55022 on radiated measurement The resolution bandwidth of the Agilent Spectrum Analyzer N9010A 526 was set at IMHz The frequency range above was checked and all final readings of measurement were with Peak and Average detector In chapter 7 6 6 1 the standard EN 55016 2 3 2010 requires to include the values of w 1n the test report w The
35. n approval of AUDIX Technology Corporation Date of Test 2015 03 04 16 Date of Report 2015 03 17 4 E 1 2 l L i Producer Ag Tina Huan g Adm ini rator Allen Wang Assist 49 lager Signatory AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 7 of 69 1 DESCRIPTION OF VERSION Edition No Date of Revision Revision Summary Report Number 0 2015 03 17 Original Report 150125 AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 8 of 69 2 SUMMARY OF STANDARDS AND RESULTS 2 1 Description of Standards and Results The EUT has been tested according to the applicable standards as referenced below EMISSION Description of Test Item Standard Limits Results Class B PASS Minimum passing margin is 13 69dB at 0 182MHz Conducted disturbance EN 55022 2010 AC 2011 Class B N A Telecommunication port Class B Minimum passing margin is 4 28dB at 599 39MHz Class B PASS Minimum passing margin is 6 78dB at 1020 21 MHz EN 61000 3 2 2014 Class D PASS Voltage fluctuations amp flicker EN 61000 3 3 2013 Section 5 IMMUNITY EN 55024 2010 Conducted disturbance EN 55022 2010 2011 g 2 Un Un Radiated disturbance 30 1000MHz 55022 2010 AC 2011 Radiated disturbance Above 1GHz EN 55022 2010 AC 2011 9 2 Un Un Description of Test Item Basic Standard cnn md n EN 61000 4 2 2009 6
36. nd test generator as shown on section 14 2 14 5 2 The interruptions was introduced at selected phase angles with specified duration There was a 10s minimum interval between each test event 14 5 3 After each test a full functional check was performed before the next test 14 5 4 Repeat procedures 14 5 2 amp 14 5 3 for voltage dips only the test level and duration was changed 14 5 5 Record any degradation of performance 14 6 Test Results PASSED Complied with Criterion C in Voltage Interruption amp Criterion A in Voltage Dips The EUT with the worst test mode SKU 1 was measured and the test results are listed next page AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 57 of 69 Voltage Dips Short Interruptions Voltage Variations Immunity Test Results AUDIX TECHNOLOGY CORPORATION Applicant INTEL CORP Test Date 2015 03 11 EUT Intel Compute Stick Temperature 23 Test Model STCK1A32WFC Power Supply AC 100 240V 50 60Hz Humidity 47 Via AC Adapter Working Condition See section 4 4 Test Configuration Mode SKU 1 Engineer Sam Yen single Test Voltage Phase Angle Reduction Period ous 3d Performance Criterion Voltage Dips 1 100V 225 270 315 2 240V Q 45 90 135 180 0 225 270 315 30 25 Pass A Voltage 1 100V 0 45 90 135 180 Interruptions 2 240 225 270 315 anu Note Criteria C The EUT was shut down during
37. nt wN AUDIX Technology Corporation Report No EM E150125 AUDIX Page 63 of 69 15 6 Photos of Electrostatic Discharge Immunity Test For Air amp Contact Discharge AUDIX Technology Corporation Report No EM E150125 PaE Page 64 of 69 For VCP Test _ El Ei E AUDIX Technology Corporation Report No 150125 AUDIX Page 65 of 69 Photo of ESD Test Points Photo of ESD Test Points AUDIX Technology Corporation Report No EM E150125 AUDIX Page 66 of 69 15 7 Photos of Radiated Radio Frequency Electromagnetic Field Immunity Test ig c sees 4 usum uc ug d od d a d gg zu x ux d 85 aux dz dd 222454448 722222442 p AUDIX Technology Corporation Report No EM E150125 Page 67 of 69 15 8 Photos of Electrical Fast Transient Burst Immunity Test AUDIX Technology Corporation Report No EM E150125 Page 68 of 69 15 10 Photos of Immunity to Conducted Disturbances Induced by RF Fields AUDIX Technology Corporation Report No 150125 Page 69 of 69 15 12 Photo of Voltage Dips Short Interruptions Voltage Variations Immunity Test PARTNER SYSTEM AUDIX Technology Corporation Report No EM E150125
38. o EM E150125 ZIUDIX J 5 6 1 Page 25 of 69 Radiated Disturbance Measurement Results at Semi Anechoic Chamber 30 1000MHz AUDIX Data 4 80 70 60 50 40 30 20 10 0 30 Site no Dis dnt Limit Env Ins Power Rating Test Node Level dBuV m NO 1 Chamber 10m 6112D 33820 ENBBOZ2 CLASS B AUDIX TECHNOLOGY Corp EMC Department No 53 11 Dingfu Linkou Dist New Taipei City 244 Taiwan Tel 4886 2 26092133 886 2 26899383 Email emc jaudixtech com File DATEST DATAIREPORT 20151C1M1503XXXYC 1M15030031C 1M1503003 10M EMS6 1 Date 2015 03 13 EN55022 CLASS B 5 200 300 400 500 600 700 800 900 2 1000 Lata no 4 int pol HORIZONTAL 19C 52 Engineer TIM SICKIASZWEC 230Vac 50Hz nt Cable Emission Factor Logs Reading Level Limite Margin Remark dB m dB dB u V dE u T m dBuWV m dB 11 85 1 79 4 45 18 08 30 00 1 91 9 51 2 48 T B4 19 63 30 00 10 37 12 69 2 81 T 16 22 37 00 14 24 17 54 4 33 4 48 26 35 37 00 10 65 18 37 4 64 6 56 21 57 37 00 5 49 OP g 21 00 6 04 3 35 30 39 37 00 6 61 QP Remarks l Emisgzion Level Antenna Factor Cable Lose Reading emission levels that are 20dB below the official limit are not reported 3 The worst emission was 31 57dBuV m at 601 33 MHz when antenna was in horizontal polarization 1 5m height and turn
39. oration Report No EM E150125 AUDIX j Page 54 of 69 Power Frequency Magnetic Field Immunity Test Results AUDIX TECHNOLOGY CORPORATION Applicant INTEL CORP Test Date 2015 03 11 EUT Intel Compute Stick Temperature 23 C Test Model STCK1A32WFC Power Supply AC 230V 50Hz Via AC Adapter Humidity 47 Working Condition See section 4 4 Test Configuration Mode SKU 1 Engineer Sam Yen Power Coil Testing Results Performance M tic Field Frequency Orientation Duration Criterion AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 55 of 69 14 VOLTAGE DIPS SHORT INTERRUPTIONS VOLTAGE VARIATIONS IMMUNITY TEST 14 1 Test Equipment Model No 6590 65900086 2014 07 18 2015 07 17 14 2 Block Diagram of Test Setup 14 2 1 Block Diagram of connection between EUT and simulators same as Section 6 2 1 14 2 2 Test Setup I P O P AC Line Power Source To AC Power Supply Network 14 3 Test Standard and Levels and Performance Criterion EN 55024 2010 EN 61000 4 11 2004 IEC 61000 4 11 Ed 2 0 2004 Test Specification Test Level gt 95 reduction 0 5period Voltage dips 30 reduction 25period Voltage interruptions gt 95 reduction 250period 14 4 Deviation From Test Standard No deviation AUDIX Technology Corporation Report No EM E150125 AUDIX Page 56 of 69 14 5 Test Procedure 14 5 1 Set up the EUT a
40. ply 230V 50Hz Via AC Adapter Humidity 43 Working Condition See section 4 4 Test Configuration Mode SKU 1 Engineer Mike Yu Frequency Position Polarity of Field Strength Results Performance Rang Angle Antenna V m Criterion o Horizontal Modulated 30 1000MHz 90 Horizontal 3V m Modulated 1000 3Vim Modulated Pass 30 1000MHz 3Vim Modulated o Vertical Modulated 80 1000MHz Vimi Modulated Pass 80 1000MHz 3V m Modulated Pass 80 1000MHz 3V m Modulated Pass AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 43 of 69 10 ELECTRICAL FAST TRANSIENT BURST IMMUNITY TEST 10 1 Test Equipment Model No Seral Cal Dae Cal Due PLZ Immunity Test NSG 3060 2014 08 13 2015 08 12 System TESEQ CDN 3063 2014 08 13 2015 08 12 TESEQ CDN 3425 2014 08 13 2015 08 12 Coupling Clamp 10 2 Block Diagram of Test Setup 10 2 1 Block Diagram of connection between EUT and simulators same as Section 6 2 1 10 2 2 Test Setup AC Line EMS Immunity Test System To AC Power Supply Network Signal Line Insulation Support 0 1m Ground Plane Grounding Plate 10 3 Test Standard and Levels and Performance Criterion EN 55024 2010 EN 61000 4 4 2012 IEC 61000 4 4 Ed3 0 2012 Test Specification Test Level Signal and control
41. ports AC mains power input ports Tr Th 5 50ns Repetition frequency 5kHz 10 4 Deviation From Test Standard No deviation AUDIX Technology Corporation Report No EM E150125 AUDIX Page 44 of 69 10 5 Test Procedure The EUT and its simulators shall be placed 0 1m high above the ground reference plane which was a minimum area 1m x 1m metallic sheet with 0 65mm minimum thickness This reference ground plane shall project beyond the EUT by at least 0 1m on all sides and the minimum distance between EUT and all other conductive structure except the ground plane beneath the EUT shall be more than 0 5m 10 5 1 10 5 2 10 5 3 For input and output AC power ports The EUT was connected to the power mains by using a coupling device which couples the EFT interference signal to AC power lines and the length of the power line between the coupling device and the EUT shall be or less Both polarities of the test voltage should be applied during compliance test and the duration of the test can t less than 1 min For signal lines and control lines ports The interface cables length is less than 3m therefore it s unnecessary to measure For DC input and DC output power ports No DC ports It s unnecessary to measure 10 6 Test Results PASSED Complied with Criterion A The EUT with the worst test mode SKU 1 was measured and the test results are listed in next page AUDIX Technology Corporation
42. r Xar Xhuo Field Strength Performance Frequency Rang Injected Position V m Criterion Main Port Modulation Signal IKHz 80 AM AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 52 of 69 13 POWER FREQUENCY MAGNETIC FIELD IMMUNITY TEST 13 1 Test Equipment Model No Haefely Trench MAG100 1 080015 01 2014 05 15 2015 05 14 Generator 13 2 Block Diagram of Test Setup 13 2 1 Block Diagram of connection between EUT and simulators same as Section 4 2 1 13 2 2 Test Setup S INDUCTION Non Conductive Tab Generator 13 3 Test Standard and Levels and Performance Criterion EN 55024 2010 EN 61000 4 8 2010 IEC 61000 4 8 Ed 2 0 2009 Test Specification Test Level agnetic Field Strength 1 rms 13 4 Deviation From Test Standard No deviation AUDIX Technology Corporation Report No EM E150125 AUDIX Page 53 of 69 13 5 Test Procedure The EUT was placed on 0 8m high table And subjected to the test magnetic field by using the induction coil of standard dimensions 1m x 1m The induction coil rotated by 90 degrees in order to expose the EUT to the test field with different orientations All cables of EUT exposed to magnetic field for 1m of their length 13 6 Test Results PASSED Complied with Criterion A The EUT with the worst test mode SKU 1 was measured and the test results are listed next page AUDIX Technology Corp
43. rable or can be restored by the operation of the controls or cycling of the power to the EUT by the user in accordance with the manufacturer s instructions AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 10 of 69 3 GENERAL INFORMATION 3 1 Description of EUT Product Intel Compute Stick Test Model STCK1A32WFC Family Product Code Where x may be a combination of alphanumeric characters or blank Serial Number N A INTEL CORP Applicant HF3 96 5200 NE ELAM YOUNG PKY HILLSBORO OR 97124 USA Power Supply Rating Refer to AC adapter rating Date of Receiptof 1 2015 Q5 26 Sample HDMI Port 1 USB 2 0 Port 1 Micro USB 2 0 1 Micro SD Card Slot 1 Interface Ports of EUT AUDIX Technology Corporation Report No EM E150125 AUDIX Page 11 of 69 3 2 Descriptions of Key Components and Operating Modes 3 2 1 List of key components under test 2 STCK1A32WFC IS With 32G eMMC and 2GB memory Mother Board Intel and 2 STCKIASLFC IS 1 mmc and 1GB memory CPU Intel CPU Socket BGA592 c 2 IC DDR3L SDRAM 256M 16 HYNIX ice DDR3L SDRAM 128M 16 1GB Micron DDR3L SDRAM 128M 16 SAMSUNG eMMC TOSHIBA 8G THGBMBG6DIKBAIL EMMC32G S100 WB9 KINGSTON EMMC08G S100 802 11 b g n Wireless LAN REALTEK RTL8723BS Bluetooth 2 1 EDR BT4 0 for BT peripherals Linking T 543 8321061 PIFA
44. requency bands 2 Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the E U T 5 3 2 Limit above IGHz Frequency Distance Average Limits Peak Limits GHz Meters dBuV m dBuV m Note 1 The lower limit applies at the transition frequency 2 Distance refers to the distance in meters between the measuring instrument antenna and the closed point of any part of the E U T 5 4 Operating Condition of EUT Same as conducted disturbance measurement which 1s listed 1n 4 4 except the test set up replaced by section 5 2 5 5 Test Procedure For Frequency Range 30MHz 1000MBZz which was measuring at Semi Anechoic Chamber The EUT and its simulator were placed on a turn table which was 0 8 meter above ground The turn table rotated 360 degrees to determine the position of the maximum emission level EUT was set 10 meters away from the receiving antenna which were mounted on an antenna tower The antenna can move up and down between 1 meter and 4 meters to find out the maximum emission level Broadband antennas Bilog Antenna were used as a receiving antenna Both horizontal and vertical polarization of the antenna was set on measurement In order to find the maximum emission all of the interface cables were manipulated according to EN 55022 requirements The bandwidth of the R amp S Test Receiver ESCT7 was set at 120 kHz The frequency range fro
45. rom the transmitting antenna which is mounted on an antenna tower and fixes at 1 55 meter height above the ground Using the recorded signal generator s output level to measure the EUT from frequency range 80MHz 1000MHz and both horizontal amp vertical polarization of antenna must be set and measured Each of the four sides of EUT must be faced this transmitting antenna and measures individually In this report chose the most sensible side to measure that 15 right side to face transmitting antenna A CCD camera was put inside the chamber and through its display to monitor the EUT operational situation to judge the EUT Compliance criterion during measurement the scanning conditions are as follows Condition of Test Remarks 1 Field Strength 3V m 2 Amplitude Modulated IkHz 80 AM 3 Scanning Frequency 80MHz 1000MHz step Size 1 increments 4 The Rate of Sweep 0 0015 decade s 5 Dwell Time 3 Sec AUDIX Technology Corporation Report No EM E150125 AUDIX Page 41 of 69 9 6 Test Results PASSED Complied with Criterion A The EUT with the worst test mode SKU 1 was measured and the test results are listed next page AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 42 of 69 Radiated Electromagnetic Field Immunity Test Results AUDIX TECHNOLOGY CORPORATION Applicant INTEL CORP Test Date 2015 03 09 EUT Intel Compute Stick Temperature 21 C Test Model STCK1A32WFC Power Sup
46. table was at 110 4 Degree is calculated from 0 clockwise facing the antenna AUDIX Technology Corporation Report No EM E150125 AUDIX Page 26 of 69 AUDIX TECHNOLOGY Corp EMC Department AW DIX No 53 11 Dingfu Linkou Dist New Taipei City 244 Taiwan Tel 4886 2 26092133 886 2 26099303 Email emc audixtech com Data 3 File DITEST DATAAREPORT 20151C 1M1503XXX C1M1503003 C 1M1503003 10M EM6 1 go evel dBuVim Date 2015 03 13 70 60 50 40 EN55022 CLASS B 30 20 10 d 30 100 200 300 400 500 600 700 800 900 1000 2 bite NO 1 Chamber Data no 3 Dis dnt 10m 6112 33819 nt pol VERTICAL Limit END5O022 CLASS B Env Ins 190 52 Engineer EUT SICKIASZWPC Power Rating 230 ac 50Hz Test Mode nt Cable Emission Freq Faetor Logs Reading Level Limits Margin Remark MHz dB m dB dB V dE Vm dB 1 7 88 0 83 13 44 2A l5 30 00 7 65 2 1285 03 11 82 1 36 12 04 30 00 4 68 S x1 10 04 1 83 13 83 20 TO 30 00 4 50 4 229 82 11 14 1 92 10 26 1 22 30 00 6 68 599 99 18 26 Ga 11 08 52 57 00 4 28 958 29 21 07 4 41 Dur Dis ho 37 00 1525 Remarks 1 Level Antenna Factor Cable Lose Reading 2 emission levels that are 2 dB below the official limit are not reported 3 The worst emission was 32 72dBuV m at 599 39MHz wh
47. thin 30 596 of the nominal value to 6 7 2 Let EUT work as stated and through Universal Power Analyzer to measure the EUT to get the harmonic current for Odd amp Even harmonics up to 40th Test Results PASSED Complied with Criterion D The EUT with the worst test mode SKU 1 was measured and the test results are listed next pages AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 31 of 69 Harmonics Class D Run time EUT STCK1A32WFC Tested by Sam Yan Test category Class D European limits Test Margin 100 Test date 2015 3 11 Test duration min 2 5 Data file name H 000499 cts data Comment Test Result N L Source qualification Normal Current amp voltage waveforms 300 200 5 100 8 o o 100 5 LU 200 300 Harmonics and Class D limit line European Limits _ 0 0175 0 0150 5 0 0125 2 0 0100 0 0075 0 0 0050 3 0 0025 0 0000 4 8 12 16 20 24 28 32 36 40 Harmonic Test result N L Worst harmonic was 19 with 930 4 of the limit AUDIX Technology Corporation Report No EM E150125 ZIUDIX J FUT STCKT1A32WFC Test category Class D Test date 2015 3 11 Test duration min 2 5 Comment SKU 1 Test Result N L 0 000 Highest parameter values during test V RMS Volts Amps Fund Amps 0 016 Power Watts Data file name H 000499 cts data THD 0 0 230 07 0 327 3 5 European
48. to establish a basic configuration of system during test Mother Board STCK1A32WFC IS me and 2GB memory CPU Intel Atom CPU Socket 592 2GB Memory HYNIX HSTC4G63AFRPBA C SDRAM 256M 16 e 802 11 b g n Wireless LAN WiFi Combo REALTEK RTL8723BS Bluetooth 2 1 EDR BT4 0 for BT Module peripherals Antenna EE T 543 8321061 PIFA Antenna 2 95dBi Technology Inc AC Input AC Adapter Ae 1 2C 100 240V 50 60Hz 0 4A Max DC Output 5V 2A Micro USB Cable Shielded Detachable 1 0m HDMI Cable Shielded Detachable 0 2m AUDIX Technology Corporation Report No EM E150125 AUDIX j Page 13 of 69 3 2 4 Description of Test Modes The worst mode was reported for emission and immunity aen Memory eMMC Resolution Test Test Voltage Mode HYNIX SAMSUNG 1920 1200 60Hz PES HSTC4G63AFR PBA KLMBGAGEND B031 32bit 200 Font Size 3 3 Description of Tested Supporting Unit and Cable 3 3 1 RET Unit Product Brand Model Model No SeralNo NO ID Remarks MY 0W217F 71619 by CN OPHSNY 74445 Provided by LCD Monitor DELL U301 IT ICM 142L By DoC Provided by C MICRO SD Card Kingston NSDCA SGB N A N A LAB FCC ID by 2 Notebook TP00034A 895097 By DoC FCC ID 2 Rss orias 3 3 2 Cable Lists as UE 9 Provided by LAB e a 3 Micro USB Cable
49. tor intervention No degradation of performance or loss of function 15 allowed below a minimum performance level specified by the manufacturer when the EUT 15 used as intended The performance level may be replaced by a permissible loss of performance If the minimum performance level or the permissible performance loss 15 not specified by the manufacturer then either of these may be derived from the product description and documentation and by what the user may reasonably expect from the EUT if used as intended 2 2 2 Performance criterion B After the test the EUT shall continue to operate as intended without operator intervention No degradation of performance or loss of function 15 allowed after the application of the phenomena below a performance level specified by the manufacturer when the EUT 15 used as intended The performance level may be replaced by a permissible loss of performance During the test degradation of performance 15 allowed However no change of operating state or stored data 1s allowed to persist after the test If the minimum performance level or the permissible performance loss 15 not specified by the manufacturer then either of these may be derived from the product description and documentation and by what the user may reasonably expect from the if used as intended 2 2 3 Performance criterion C During and after testing a temporary loss of function 15 allowed provided the function 15 self recove
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