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601-279B - NSG 3040 User Manual english.indd

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1. NSG 3040 EMC TEST SYSTEM USER MANUAL 601 279B advanced Test Solutions for EMC NSG 3040 EMC TEST SYSTEM USER MANUAL CONTENTS 2 1 3 1 3 2 3 4 3 5 4 1 4 2 4 3 4 4 4 5 4 6 4 7 5 1 5 2 5 2 1 5 3 6 1 6 1 1 6 1 2 6 1 3 6 1 4 Explanation of symbols Introduction General description Standards and applications Burst test Combination wave test Mains quality test Magnetic fields with mains frequency option Pulsed magnetic fields option Safety instructions General nstallation nstallation of an EUT power switch Applicable safety standards Test execution User warnings Generator User warnings EUT Installation NSG 3040 installation Grounding the test system to the ground reference plane Rear ground brackets ounting in a 19 rack Mainframe description ront panel UT output connection igh frequency ground terminal urge output sockets urst output socket T rm m 10 10 11 12 12 12 13 13 14 15 16 17 18 19 20 21 21 22 22 23 23 23 24 25 25 6 1 5 6 1 6 6 2 6 2 1 6 2 2 6 2 3 6 2 4 6 2 5 6 2 6 7 7 1 72 7 3 74 7 5 7 6 7 6 1 7 6 2 77 Z4 FAD 78 8 8 1 8 2 8 3 8 3 1 8 3 2 8 3 3 8 3 4 8 3 5 8 3 6 8 3 7 8 3 8 8 3 9 ndicator LEDs Touch panel and user interface Rear panel ains power input EUT power input AC EUT mains input DC EUT input Ground connection point System interface connector 25 pin D s
2. 9 5 EUT fail input Between Pin 6 hi and Pin 2 8 15 20 low Input open Inactive Input shorted active This connection serves as a control input of the EUT conditions that can be activated externally The EUT can activate this input if it is capable of reporting a disturbance effects caused during an EMC test Such events are time date stamped by the system and are stored together with the current test parameters for subsequent use in a test report NSG 3040 EMC Test System 10 INTERNAL COUPLING NETWORK The NSG 3040 includes a built in coupling decoupling network CDN that conforms to IEC EN 61000 4 4 for 1 phase supply with neutral and protective ground line Parameter EUT supply EFT burst Value 1 phase output on IEC socket 24 to 270 V rms 50 60 Hz Phase Neutral 400 Hz max 1x 16 Arms continuous temp controlled 1 x 25 Arms for 30 min 0 to 270 VDC 16 A max Standard coupling mode all lines to HF reference ground GND IEC EN 61000 4 4 and ANSI IEEE C62 41 L PE gt ref GND Alternatively possible Any lines and combinations to ref GND LS ref GND N gt ref GND PE ref GND LN gt ref GND gt rei GND N PE gt ref GND TASEO Advanced Test Solutions for EMC 75 76 Combination wave pulse surge ROT Decoupling attenuation Standard conform pulse Mains decoupling Connections NSG 3040 EMC Test System EC EN 61000 4 5 Lines to ground
3. matching system 1V 10V 100 V Positive negative alternate Hz 100 to 99 999 kHz 1to 11000 Asynchronous synchronous 0 to 359 in 1 steps IEC pulse output external us 1to99 999 ms 1to99 999 SI 1 to 1 999 Spikes ms 1to 99 999 S 1 to 4 200 70 min Si 1 to 99 999 min 1 to 99 999 TOMO OO Continous 8 3 12 DTA selection window for burst Direct Test Access is not available in the current TSI software version 8 4 Combination Wave CW Surge pulse testing The surge test generates high voltage surge pulses as specified in the interna tional standard EN IEC 61000 4 5 and ANSI C65 41 8 4 1 Test configuration for power supply line coupling The test pulses are injected directly into the EUT power supply lines as they pass through the test system The EUT obtains its power from the EUT power outlet on the front of the NSG 3040 where the voltage has the interference Signal superimposed on it NSG 3040 EMC Test System 8 4 2 Test configurations with external coupling 59 In this mode the interference pulses are switched to the surge Hi and Lo output sockets on the front panel to which an external data line signal coupler can be connected By using such an external signal coupler it is possible to superim pose the interference signal as specified in the standards on communications cables and other kinds of data lines The same coaxial HV output sockets may also be used for connection of a
4. v OK If an option is connected with a built in EUT switch like INA 6502 or external automated CDN then the screen looks like If an option with a built in EUT Switch such as an INA 6502 or an external automated CDN is connected General settings Beeper volume n ator Interlock action Expert mode bile FACTORY SETTINGS IA A e If an automatic variac is connected General settings Beeper volume On os 230 d ET Interlock action EUT powe Expert mode Off FACTORY SETTINGS M oK Ey e TASEO Advanced Test Solutions for EMC 36 During a surge test the NSG 304 will emit a beep to alert the user The user can touch the button to turn the beep On or Off Expert mode Expert mode should follow Interlock action as that the order in which they are displayed The user can set the Expert mode button to Active to change parameters during a running test When the button is set to Off parameters can be changed only when the NSG 3040 is in Stop mode Interlock action Setting the Interlock action button to EUT Power on will keep the power to the EUT on when the interlock is activated Setting the Interlock action button to EUT Power off will cause EUT power to shut down when the interlock is activated Voltage Uin Prior to starting a test the user must measure the voltage at the power mains Socket so that it can be used as the 10096 reference point
5. 10 to 600 Test duration 1 to 9999 pulses Continuous 8 5 Mains Power Quality Testing PQT The PQT test involves the simulation of mains voltage dips and brief interrup tions as specified in the international standard EN IEC 61000 4 11 The NSG 3040 generates these disturbances on the EUT supply lines which are connected to the EUT power outlet socket A dip occurs when the nominal voltage falls by a significant amount during a certain number of cycles or a fraction thereof The standard specifies dips of 20 30 and 6096 i e the voltage falls to 80 70 and 40 of the nominal level respectively An external variac transformer or a DC power source can be connected to an extra input for freely selectable voltage dips For tests with a DC power source the supply must be connected to the appropriate pin see sections 6 2 3 and 6 2 4 An interruption occurs when the supply voltage either disappears completely for a certain number of cycles or falls to a value of less than 596 of its nominal value Note Dips and drops appear on the phase L line TASEO Advanced Test Solutions for EMC 63 64 8 5 1 Sample graphs of voltage dips drops t cycles a Voltage dip 30 40 4 7 0 10 t cycles b Voltage dip 60 c Voltage dropout 100 NSG 3040 EMC Test System 8 5 2 Setting mains PQT test parameters 65 Touch the Dips amp drop button in the main menu to open the window shown below In this
6. Us 20 to 99 999 ms 160991999 Si 1 to 1 999 Cycle 1 t0 99 999 Test duration 57 11101991999 min 1 to 70 000 Event 1 to 99 999 Continuous 8 6 Variation test _ 5 lutions for EMC P o as VOLTAGE wi M AMARE sempe rS i TASEO Advanced Test Solutions for EMC 68 Parameter Value Uvar with optional variac O to 265 V in 1 V steps O to 11596 in 196 steps Repetition time 1 ms to 35 min 1 to 99 999 cycles Test duration 1 ms to 5 s 1 to 250 cycles 50 Hz 1 to 300 cycles 60 Hz abrupt Repetition time 10 ms to 10 s 1 to 250 cycles 50 Hz 1 to 300 cycles 60 Hz Test duration 1s to 99 999 min 1 to 99 999 events Continuous Phase synchronization Asynchronous synchronous 0 to 359 in 1 steps Automatic accessories for power quality test Automated accessories for PQT testing include the INA 6502 step transformer the VAR 6501 single variac and the VAR 6502 double variac These accessories are fully compliant with the latest revision of IEC EN 61000 4 11 2004 Once detected the functions of each of these accessories are displayed and can be controlled in the dips and drops parameter setting window INA 6502 step transformer UVar settings 0 40 70 80 will be dis played VAR 6501 single variac Settings can be displayed in volts or of Uin Touch the units button in the example to select volts
7. Users must be aware of the following dangers that can occur during testing EUTs are often functional samples that have not yet been subjected to safety tests It is therefore pos sible that the EUT could be damaged by internal overloads or may even start to burn As soon as the EUT shows signs of being disrupted the test should be stopped and the power to the EUT switched off Internal disruption of the electronics can result in the interference voltage or the EUT supply voltage being present on the EUT s outer casing Electrical breakdown or arcing from and within plugged connections that are overstressed by voltage during the test Explosion of components with fire or fragmentation as a result of energy dissipated e g from the resul tant supply current or ignition of vaporized plastics materials Faulty behavior by the EUT e g a robot arm strikes out or a temperature controller fails etc TASEO Advanced Test Solutions for EMC 20 5 INSTALLATION This chapter contains a short check list with steps that should be taken before the instrument is switched on and put into operation Upon delivery check the packaging for signs of damage in transit If the indicator panel on the shock watch is colored it means that the package has suffered a shock during transit Any damage should be reported immediately to the transportation company Lift the NSG 3040 test system out of its packaging by grasping the mount
8. 12 2PE N 5PE L N SPE Line to line 2 Q N gt L L gt PE N gt PE EC EN 61000 4 11 4 29 Dips amp drops to phase L Remanent pulse voltage 15 max Mains side crosstalk 15 max 1 2 50 US up to 4 4 kV 8 20 us up to 2 2 kA 1 5 mH 0 35 Pulse inputs from generator Cable connector for EUT supply Power inlet for CDN 11 MAINTENANCE AND CHECK 11 1 General FUNCTION 77 There are no components in the NSG 3040 that are accessible to users for either maintenance or calibration purposes The NSG 3040 housing must not be opened by the user If maintenance or repair is necessary the system must be sent to an autho rized Teseq service center The only maintenance tasks which may be performed by the user are Cleaning the outer housing Performing function checks Verifying pulse parameters Adding or exchanging modules The only exception concerns the exchange of modules or the upgrading of the system with new modules In such cases the instructions accompanying the modules are to be strictly observed 11 2 Cleaning n general a moist cloth is sufficient for cleaning th foaming household cleanser may be mixed with cloth No chemicals acid etc should be used for cleanin outer housing of the NSG 3040 including the touch panel If necessary a small amount of a mild non water and applied with a g Before cleaning the system be sure that it is switch ca
9. 200 A MD 300 NSG 3040 EMC Test System Value W 449 mm 17 7 H 222 mm 8 75 5 HU D 565 mm 22 2 22 kg 48 5 Ib Description Combined surge amp burst coupling network for 480 VAC Ph Ph 32 A Combined surge amp burst coupling network for 480 VAC Ph Ph 63 A Capacitive coupling clamp for burst Burst coupling network 100 A per phase coupling all to ref ground Coupling networks for signal data lines surge Burst EFT verification set Voltage differential probe Current probe 13 3 Accessories for IEC EN 61000 4 11 83 Model Description INA 6501 Manual step transformer 16 A 0 40 70 80 INA 6502 Automatic step transformer 16 A 0 40 70 80 VAR 6501 Automatic variable transformer 7 5 VAR 6502 Automatic variable transformer 2 x 16 A VAR 6503 Manual variable transformer 7 5 A 13 4 Accessories for IEC EN 61000 4 8 4 9 Model Description MFO 6501 Manual magnetic field option 4 8 MFO 6502 Automatic magnetic field option 4 8 INA 701 Magnetic field loop 1 x 1 m with MFO max 3 6 A m 4 8 Surge max 1200 A m 4 9 INA 702 Magnetic field loop 1 x 1 with MFO max 40 A m 4 8 Surge max 1200 A m 4 9 Pulse shape adapter INA 753 recommended to surge generator INA 753 Pulse shape adapter TASEO Advanced Test Solutions for EMC 84 14 SYSTEM DESCRIPTION EE Description Housing Mains on off Indicator LED s on front panel Safety functions Ambient conditions Self t
10. 4 8 by adding the following accessories an INA 701 or INA 702 magnetic field coil combined with an INA 752 1 2 50 us pulse shape adapter Parameter Value Field 1 to 1200 A m in 1 A m steps Polarity Positive negative alternate Repetition time 5sto 10 min in 1 s steps Impedance 20 Coil factor 0 01 to 50 00 Test duration 1 to 9 999 pulses Continuous Phase synchronization Asynchronous synchronous 0 to 359 in 1 steps 8 8 Power magnetic field in conjunction with MFO To generate power line magnetic fields as required by IEC EN 61000 4 9 Teseq offers both a standalone manual solution and an automatic solution consist ing of a MFO 650X power amplifier combined with an INA 701 or INA 702 field loop Parameter Value Field 1 to 40 A m in 1 A m steps Frequency 50 60 Hz Coil factor 0 01 to 99 99 Test duration 1 to 9 999 pulses Continuous Further details see chapter Accessories for 4 9 NSG 3040 EMC Test System 9 SYSTEM INTERFACE FUNCTIONS The system interface connector 25 pin D sub has the following functions and n D Signal ignal line to pin allocations Remark Since time critical information cannot be transferred quickly enough trans mission time for one message frame takes about 20 ms an additional the synchrobus is used to speed transmission Th hits can all access this bus The master contro to other instruments via the sub D connector mains synchroniz
11. EUT its accidentally During a test the EUT its accessories and cables are to be considered live at all times The test system must be stopped and the EUT supply disconnected before any work can be carried out on the EUT This can be achieved simply by opening the Interlock circuit The EUT is to be tested only in a protective cage or under a hood which provides protection against electric shock and all manner of other dangers pertaining to the particular EUT see User warnings Generator The safety instructions for all the instruments and asso ciated equipment involved in the test setup Test setup configuration is to be strictly in compliance with the methods described in the relevant standard to ensure that the test is executed in a compliant manner TASEO Advanced Test Solutions for EMC 18 4 6 User warnings Generator WARNING Users must be aware of the following dangers that can occur during testing Local burning arcing ignition of explosive gases EUT supply current surge caused by a flashover or breakdown resulting from the superimposed high voltage Disturbance of other unrelated electronics telecom munications navigational systems and heart pace makers through unnoticed high frequency radia tion Ground contacts including the EUT ground can be at elevated voltage levels that would make them dangerous to touch NSG 3040 EMC Test System 4 7 User warnings EUT WARNING
12. FlashDisk UserTest EFT 1 61000 4 4 2004 LEVEL2FOR DATA LINES EFT IEC61000 4 4 2004 LEVEL1 FOR DATA LINES EFT IEC61000 4 4 2004 LEVEL3 FOR DATA LINES EFT RAMPING TEST EFT LONGTERM TEST LEVEL2 COUPLING ON L1 PE EFT The user can select a test by touching the button to the left of the test name A red border will be displayed around the selected test Touch the OK button to load the test and return to the test parameter window Load User test FlashDisk UserTest EFT IEC61000 4 4 2004 LEVEL2FOR DATA LINES EFT 1 61000 4 4 2004 LEVEL1 FOR DATA LINES EFT IEC61000 4 4 2004 LEVEL3 FOR DATA LINES EFT RAMPING TEST EFT LONGTERM TEST LEVEL2 COUPLING ON L1 PE EFT NSG 3040 EMC Test System Touch the Delete button to delete a saved test A window asking the user to 51 confirm or cancel this action will be displayed Touch OK to delete the file or cancel to cancel this action NOTE Once a test has been deleted it cannot be restored Load User test FlashDisk UserTest EFT IEC61000 4 4 2004 LEVEL2FOR DATA LINES EFT I IEC61000 4 4 SHOW GRAPHICS Touching the Show Graphics button will display pulse graphs and coupling diagrams for the selected test The user can view additional information by touching the More button and can touch the Back button to page back Touch Exit to return to the test parameter window TASEO Advanced Test S
13. This selection is for non automated external CDN like CDN 3083 Touch the OK button to save all settings and return to the combination wave settings window Touch the cancel button to return to the combination wave settings window without saving the coupling settings Touch the Show graphics button to display the combination wave graphics with the selected coupling settings 8 4 8 Repetition time Touch the Repetition time button 300 in the example to set the test repetition time A red frame will be displayed around the field The repetition time may be entered using the wheel or the keypad Touch the units button 5 in the example to set the time unit Time units are sand min 8 4 9 Test duration Touch the Test duration button 10 in the example to set the test duration time A red frame will be displayed around the field The duration time may be entered using the wheel or the keypad Touch the units button pulse in the example to set the test duration Test duration options are pulse and continuous NSG 3040 EMC Test System 8 4 10 Combination wave generator technical data Parameter Value Pulse voltage open circuit 200 V to 4 4 kV in 1 V steps Pulse current Short circuit 100 A to 2 2 Impedance 21120 Polarity Positive negative alternate Phase synchronization Asynchronous synchronous 0 to 359 in 1 steps Coupling IEC external Pulse repetition s
14. button is touched a red frame is dis played The user can set the step delay value with either the wheel or the keypad TASEO Advanced Test Solutions for EMC 48 OK Touch the button to save all setting and return to the test parameter window Note When a parameter has been ramped its value cannot be changed in the Test parameter window EXIT Touch the Exit button to return to the test parameter window without saving settings ADD STEP Multi step tests can be programmed manually in the Test parameters window using the Add Step button in the red menu bar Touching the Add Step button will open a test step window The user can program a maximum of 10 test steps AS soon as a test step is programmed TEST 1 X is displayed in the upper right corner and the test can no longer be changed from the Test parameter window All programmed steps must be deleted before resetting any other test param eters When a test is initiated it will always start with the first step and proceed to the last step OK Touch the OK button to save all setting and return to the test parameter window EXIT Touch the Exit button to return to the test parameter window without saving settings NSG 3040 EMC Test System SHOW STEP The user can view change the order of and delete individual test steps by touch ing the show step button on the red menu bar The Show step windows displays the
15. for DC voltages L Positive N Negative 2 In of DC applications the positive and negative lines are to be connected to La and N respectively The polarity at this EUT power input connector must be the same as at the EUT output connector The ground contact in the connector must be connected to a solid ground point 30 25 20 W wire 2 5 mm W wire 1 5 mm Operating current a al W wire 1 0 mm 20 40 60 80 100 120 C Ambient temperature 6 2 5 Ground terminal The ground terminal provides a solid connection point to the instrument s chassis ground TASEO Advanced Test Solutions for EMC 30 6 2 6 System interface connector 25 pin D sub This connection provides external device control and interlock capability If the NSG is used as a stand alone unit the interlock dummy connector must be plugged in for the system to start Automated equipment such as CDNS variacs and step transformers must be linked together The interlock termination connector must be placed on to the system output plug of the last unit of the system Pin Sync line Signal Remark Working direction Mains Mains voltage passes From a coupling net 7 synchronization through the zero crossing work y point with rising signal Puts the NSG 3040 into an 5 sync1 Interlock idle state The Error LED SS ights
16. for variation tests The value must be entered in the Voltage Uin field using the keypad button at the bottom of the window Keypad The keypad button at the bottom if the window is activated only when the user selects a field that requires a numeric parameter see section 8 may vary depending on location and season it is impor tant to take an accurate measurement with a standard digital multi meter Since the voltage measured at the power mains socket Exit Touch the Exit button to return to the system window without saving the settings EUT OFF The EUT on off button is used only when an option with a built in EUT switch such as an INA 6502 or VAR 6502 is connected to the NSG 3040 The NSG NSG 3040 EMC Test System 3040 itself does not have an EUT switch Touching the button will turn the EUT 37 switch on or off OK Touch the button to save all settings and return to the system window Factory reset Touching the Factory Settings button will cause the properties associated with each of the buttons in the system window to be reset to the original factory settings 7 4 System window Equipment Equipment details 5013000 080922 MODMC_MU 0001 27 513 CDN3041 0001 15f 19 1 8 2008 1 8 2008 Wiese PQM3403 0001 15f 359 8 2 2008 8 2 2008 V Bayer HVM3040 0001 15f 161 NA NA NA By touching the Equipment button in the system window the user can access alistof
17. individual test steps in the order that they will be executed E UP DOWN The UP and DOWN arrows on the right side of the show step window aree used to change the test step order When the user touches a line number a red frame will appear around the corresponding test step The user can then touch the UP or DOWN button to move that step up or down in the list DEL Touch the DEL button to delete an individual test step OK Touch the OK button to save all settings and return to the test parameter window m EXIT Touch the Exit button to return to the test parameter window without saving settings EXPERT MODE Expert mode allows the user to manually adjust some parameters with the wheel while a test is in progress and is a fast effective method of activating critical threshold values Expert mode is available only for burst testing 8 2 The bottom bar E LOAD pee The functions shown in the bottom bar of the test parameter window are available only in software revisions 1 1 and up TASEO Advanced Test Solutions for EMC 49 50 LOAD USER TEST Touching this button will display all test files that have been created and saved by the user Only files for the selected test will be displayed In the example below several burst tests are displayed The user can scroll through the tests by touching the UP and DOWN arrows on the right side of the screen Load User test
18. mains quality testing purposes WARNING Because there are capacitors in the internal coupler ground leakage currents of up to 4 A can occur in the EUT power supply network The test system must therefore be correctly grounded and powered from a supply that is not protected by a residual current detec tor RCD TASEO Advanced Test Solutions for EMC 27 28 6 2 3 AC EUT mains input The EUT mains input is the connection point for the power supply of the equip ment to be tested The connector HAN3a 4 pin from Harting is a special 16 A type A matching connector with 2 m of cable to connect the input to a normal mains outlet is included with the system The connector comprises the pole contact La no 1 the variable voltage pole contact Lb no 3 the neutral return contact N no 2 and the ground connec tion to the EUT Pin 3 Lb Variable voltage Pin 2 N Neutral Pin 1 La Phase Pin 4 GND Ground Wire colors and pin configuration Black Phase conductor La Pin 1 Blue Neutral return Pin 2 Brown Variable voltage pole Lb Pin 3 Green yellow Ground conductor Pin 4 The additional variable voltage pole contact Lb no 3 enables a variac or alter native AC source or a DC source to be connected for PQT tests Thus the voltage at the phase L line at the EUT output connector can be varied in relation with the voltage at this contact NSG 3040 EMC Test System 6 2 4 DC EUT input 29 Pin allocation
19. of the EUT cou pling relays and the detection of the EUT input power for synchronisation reason Therefore the EUT output is to be considered as carying EUT power all the time WARNING The NSG 3040 will start a self test when it is 4 2 Installation The NSG 3040 test system conforms to protection class 1 Local installation regulations must be respected to ensure the safe flow of leakage currents WARNING Operation without a ground connection is d forbidden Two independent ground connections are necessary one for the test system and one for the EUT These must be connected back to the local permanent installation or to a fixed permanent ground conductor Operate the equipment only in dry surroundings Any condensation that occurs must be allowed to evaporate before putting the equipment into operation Do NSG 3040 EMC Test System not exceed the permissible ambient temperature or humidity levels Use only officially approved connectors and accessory items Ensure that a reliable return path for the interference current is provided between the EUT and the generator The reference ground plane and the ground connections to the instruments as described in the relevant test standards serve this purpose well The test system may only be opened upon specific instruction given by the manufacturer Since the instrument works on principle with two independent power supplies one for the generator and one for the EUT the NSG 30
20. screen The test can be continued by pressing the START button on the front panel If the user sets the button to CONT the test will continue even if the EUT stops functioning NSG 3040 EMC Test System OK 41 Touch the button on the right side of the screen to save all settings and return to the system window EXIT Touch the Exit button on the right side of the screen to return to the system window without saving settings 7 7 System window SD card properties This feature is not yet implemented fi This function is actually not supported The NSG 3040 includes an integrated SD card reader which can be used to download software updates 7 7 1 Using the SD card to update TSI software The TSI firmware version can be checked by touching the System button on the main menu _TASEO ed Test Solutions for EMC Bec NE ec A as m TASEO Advanced Test Solutions for EMC 42 Touch the EQUIPMENT button System window ame Equipment detail SUI 3000 0001 00A Identifies the TSI version MODMC_MU 0001 23A 4 5 2007 4 5 2007 HVS6601 0001 140 1 1 2003 1 1 2003 EFT6601 0001 140 14 1 1 2003 1 1 2003 RW6601 0001 14k 35 1 1 2003 1 1 2003 To update the TSI software first switch off the generator and remove all power cords and cables Open the top housing cover of the generator as described below 7 7 2 Removing and replac
21. window the user can modify the following parameters Test voltage variation phase voltage dip or drop duration repetition time and test duration Dips and Drops test Voltage Uvar External AMP VALUE Phase 90 Synch T Event 10 ms 2 Repetiti Test epetition Time w s Duration 3 Put 4 Su 23 a E 8 5 3 Voltage U Var If no automatic variac or automatic transformer is connected to the NSG 3040 the dips and drops voltage is always 0 Volt If a manual voltage source is connected then the dips and drops level will cor respond with the manually set variable voltage at the EUT input 8 5 4 Phase Touch the Synch Asynch button Synch in the example to activate the synchro nization of test pulses to the EUT mains frequency When this button is set to Asynch the phase value button 90 in the example will display When this button is set to Synch the user must also set the phase value To set the phase value touch the phase value button A red frame will be displayed around the field The phase value may be entered using the wheel or the keypad The value is in degree units and may range from 0 to 359 Synch mode is only available if the EUT power is switched on TASEO Advanced Test Solutions for EMC 66 8 5 5 Repetition time Touch the Repetition time button 10 in the example to set the test repetition time A red frame will be displa
22. 3 phase CDN a Front time T1 1 67 1 2 US 30 Time to half value T2 50 us 20 0 5 0 3 0 1 t T H max 30 Front time T1 1 25 X T 8 us 20 Time to half value T2 2015 20 TASEO Advanced Test Solutions for EMC 60 WARNING The use of improper equipment when mea suring surge pulses can result in personal injury or equipment damage NOTE Teseq recommends using a TESEQ MD 200 or MD 200A differential probe in combination with a TESEQ INA 6560 Fischer to banana adapter for all surge tests 8 4 3 Setting surge test parameters Touch the Combination wave button in the main menu to open the window shown below In this window the user can modify the following parameters test voltage impedance and phase external coupling repetition time and test duration Combination Wave Surge test Volt at 200 XE L N PE Repetition 20 Time 5 prase Ehe LOAD Load P tse STAND Ou TEST Ej TEST 8 4 4 Voltage Touch the polarity button ALT in the example to select test polarity Polarity values are positive POS negative NEG or alternating ALT Touch the voltage button 200 V in the example to enter the test voltage A red frame will be displayed around the field The voltage value may be entered using the wheel or the keypad NSG 3040 EMC Test Sy
23. 40 must be disconnected from both sources before any modifications to the test setup are undertaken Besides the mains connections themselves certain compo nents also operate at high voltages and are not provided with any form of extra protection against accidental contact 4 3 Installation of an EUT power switch The EUT input should be connected a properly rated power switch device which should be located close to the test setup In order to ensure an easy and quick access to the EUT power the switch should be clearly and visibly labelled as a device for EUT power on off The in house power distribution must be equipped with a proper circuit breaker and an emergency off button as per IEC 61010 1 2001 The test setup should only be accessible to trained per d sonnel Dimensioning of mains supply and rating of fuse protection of AC or DC power supply must conform with national prescriptions and EUT requirements Inapropriate arrangement mounting cabling or handling of the EUT or the pro tective elements can hamper or negate the effectiveness of the NSG 3040 s safety features TASEO Advanced Test Solutions for EMC 15 16 4 4 Applicable safety standards The NSG 3040 conforms to the safety requirements specified in IEC 348 and offers all the features necessary for save and efficient operation The NSG 3040 was developed and is manufactured in compliance with ISO 9001 The system complies with the safety requirement
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25. SG 3040 EMC Test System In connection with the supplied ground strap the NSG 3040 system may be efficiently connected to the reference ground plane This ground link must be used for burst tests to obtain the best test results 6 1 3 Surge output sockets These sockets high low connect the surge output signal to an external CDN or to another external coupling unit These coaxial sockets are also used to connect the internal generator to the optional magnetic field coil for tests with pulsed magnetic fields The surge output is potential free floating The inner conductor of each con nector is the surge high and surge low connection respectively while the outer conductor screen is connected to the NSG 3040 s ground terminal 6 1 4 Burst output socket This socket connects the instrument to an external burst coupling clamp for capacitive coupled burst tests on data lines or to an external coupling network 6 1 5 Indicator LEDs LED indicator Function Power on Instrument system in operation Pulse Shows the occurrence of a pulses or a test event High voltage active Shows that high voltage is present in the instrument EUT Power on Indicates when the EUT power supply is present at the EUT connector on the front panel Error Indicates that a system error has occurred During the boot period the LEDs switch on off TASEO Advanced Test Solutions for EMC 25 26 6 1 6 Touch panel and user interface The color 7 t
26. able Disk F SUIZ000AP 15546 KB Application 19 05 2008 13 11 O AutoCopy E amp Program Files 5 13000 Step 6 This example shows the SD card as removable disk F on the user s PC The drive letter may vary from PC to PC NOTE Do not change the SD firmware file name 8 Restart the NSG 3040 The software will reboot automatically 9 Touch the System button followed by the Equipment button to verify the firmware revision level NSG 3040 EMC Test System 7 8 System window Language 45 Language Selector By touching the Language button in the System menu the user can select one of 5 languages for the TSI software at this time only English available The NSG 3040 will automatically reboot if the language is changed OK Touch the button on the right side of the screen to save all settings and return to the system window EXIT Touch the Exit button on the right side of the screen to return to the system window without saving settings TASEO Advanced Test Solutions for EMC 46 8 SETTING TEST PARAMETERS mum While the input fields differ for each type of test the red side bar and bottom bar remain the same The following examples use the Burst test window Burst window Volt PI 20 v Burst Time i Frequency 100 1 Red bar j Bottom bar 8 1 The red menu bar Exit Touch
27. all internal and external generator modules including firmware versions serial numbers calibration dates and certificate numbers Up Down If the system includes more than 5 modules the user can scroll through the list by touching the Up and Down arrows on the right side of the screen RE Scan Usable in case some external units having been connected later on Exit Touch the Exit button to return to the system window TASEO Advanced Test Solutions for EMC 38 7 5 System window Communication Communication 172 20 65 32 SubNet 255 0 0 0 Port 1025 Gateway 0 0 0 0 MAC Address 00 0 02 00 03 57 By touching the Communication button in the system window the user can access Ethernet address information to integrate the NSG 3040 into a local area network or connect it to a PC IP address The IP Internet Protocol address is unique address used to identify devices such as computers routers printers and switches on a computer network The IP address can be entered using the wheel Subnet A subnet is a logical grouping of connected network devices which is used to partition networks into segments to simplify administration performance and security Devices on a subnet are usually located in close physical proximity and share a contiguous range of IP address numbers A subnet mask defines the boundaries of an IP subnet and hides the network address portion of an IP address The correspon
28. ards IEC EN 61000 6 1 covering equipment for household office and light industrial use and IEC EN 61000 6 2 for applications in industrial environments The NSG 3040 generates these tests in accordance with IEC EN 61000 4 2 4 5 and 11 Accessories are also available for generating optional tests to IEC EN 61000 4 8 and 9 The EU directive no 89 336 EEC for the assignment of the CE symbol to these standards and to this type of equipment ESD tests in accordance with IEC EN 61000 4 2 must be performed with a Separate simulator such as the Teseq NSG 435 NSG 437 or NSG 438 The standard calls for both air and contact discharges and the simulator is supplied with special tips for each type of test In the case of air discharges the simulator is discharged by holding the tip close to the EUT Then while depressing the trigger moving it closer to the target area until a discharge occurs Contact discharges occur with the tip of the simulator in direct contact with EUT 3 1 Burst left Burst tests in compliance with IEC EN 61000 4 4 simulate the high voltage high frequency interference pulses typically produced when an inductively loaded switch is operated Without counter measures such interference may occur when a current through an electromagnetic device e g motor circuit breaker relay fluorescent lamp etc is switched off This typ of interference can affect other equipment in either of two ways Firstly the interferenc
29. ation interlock and EUT fail functions e master controller and function ller also makes this bus available on the rear panel It comprises Working direction Mains voltage goes thro ugh the zero Mains syncrhonization crossing point with rising signal level From coupling network nterlock Connects interrupts HV supply and EUT From each controller to power relay 2 wires interlock circuit Software will stop a test run if a faul EUT fail occurs in the EUT caused by the tes ae procedure and the EUT reports this fact The controller watchdog puts this signal To the function module Watchdog on the bus when it is overlooked by its to which an error signal controller software error applies Any function unit or external instrument _ Global start trigger can generate this signal or an externa ae With delay function instrument receives a trigger to scope MC signal Sync1 to Sync3 Three freely definable synchronization Freely definable for bus signals ater options TASEO Advanced Test Solutions for EMC 71 72 9 1 Interlock Between Pin 5 hi and Pin 2 8 15 20 low This connection of function units is an integral part of the interlock safety circuit If a number are incorporated in a system then these connections can be daisy chained together to form a single safety circuit If no external interlock circ
30. behind the fan outlet on the rear panel Switch the system on and operate as stated in thethis manual 5 2 Grounding the test system to the ground reference plane As mentioned in the standard the generator must be placed on a ground refer ence plane GRP which is connected to ground A good high frequency ground connection between the test system and the GRP is absolutely essential for performing burst tests correctly Connect the ground terminal on the front panel of the NSG 3040 to the GRP by means of the link and bolts supplied TASEO Advanced Test Solutions for EMC 22 5 2 1 Rear ground brackets Rear ground brackets are optionally available to position the NSG 3040 securely without damaging the connectors when it must be placed with the rear panel on the floor with easy access to the touch screen These brackets guarantee a solid ground connection to a the GRP The stable housing construction allows the operator to make use of both back brackets as well as the handles 5 3 Mounting in a 19 rack When the NSG 3040 test system is combined with other equipment it can be useful to mount the instrument in a 19 rack The unit is 19 wide and 5U in height NSG 3040 EMC Test System 6 MAINFRAME DESCRIPTION 23 The NSG 3040 housing is specially designed for EMC applications and is EMC approved 6 1 Front panel Color touch screen Burst output E LEDs Wh
31. ble is unplugged from the supply ed off and the mains power TASEO Advanced Test Solutions for EMC 78 11 3 Function check The safety measures described previously must be strictly observed while carrying out a function check When the NSG 3040 is switched on the power LED should light up If it does not then check the mains power connection the fuses and cabling When it has successfully powered on the NSG 3040 will perform an automatic diagnostic routine The NSG 3040 will not perform tests when the interlock circuit is open If the following window appears Communication Error accept parameter NACK 13 UNSUCCESSFUL COMMAND Make sure that all selected test parameters are within specified and acceptable limits Pulse generation can be observed at the output connectors by means of an oscilloscope This is a practical way to check that the system is functioning correctly but should never be used for reference or calibration purposes 3040 as it may exceed the oscilloscope s maximum input voltage Teseq recommends using an MD 200 or MD 200A differential probe with the INA 6560 banana adapter Do not connect an oscilloscope directly to the NSG NSG 3040 EMC Test System 11 4 Calibration The combination of high voltages and high frequencies a single pulse makes the calibration of EMC pulse generators particularly demanding and difficult Teseq has one of the few accredited test laboratories that is capa
32. ble of perform ing pulse generator calibrations 11 5 Warranty Teseq warrants this instrument to be free of defects in materials and workman ship for a period of 2 years effective from the date of purchase During this period any defective component part will be repaired or replaced free of charge or if necessary the instrument will be replaced by another of equivalent value The method of repair replacement will be at Teseq s sole discretion Excluded from warranty are damage or consequential damage caused by negligent operation or use as well as the replacement of parts subject to deg radation The warranty is rendered invalid by any attempt to modify or repair the instru ment on the part of the customer or a third party Theinstrument is to be returned in its original packaging Teseq can accept no responsibility for damage in transit TASEO Advanced Test Solutions for EMC 79 80 12 CE CONFORMITY E The NSG 3040 is CE certificated The following standards apply Type of standard Remark number Product family M 5 ety requirements for electrical equipment for use standard EN 61010 n measurement control regulation and laboratory applications Electromagnetic compatibility EMC generic stan De ME Generic standard EN 61000 6 3 da d for interference radia on Pa
33. dence between subnet masks and IP address ranges follows defined mathematical formulas by assigning a value of 1 to every digit in the network address portion of the binary IP address These masked digits are not permitted to change when assigning IP addresses to devices on the local area network The subnet mask can be entered using the wheel NSG 3040 EMC Test System Gateway A gateway is a node on a network that serves as an entrance to another network In enterprises the gateway is the computer that routes the traffic from a workstation to the outside network that is serving the Web pages In homes the gateway is the ISP that connects the user to the internet nenterprises the gateway node often acts as a proxy server and a firewall The gateway is also associated with both a router which use headers and forward ing tables to determine where packets are sent and a switch which provides the actual path for the packet in and out of the gateway The gateway address which is usually 0 0 0 0 can be set using the wheel Port Network ports can be either physical or virtual connection points The NSG 3040 has a physical Ethernet port that allows it to be connected to a PC or router The port address for the NSG 3040 should be set to 1025 using the wheel MAC address Media Access Control MAC technology provides a unique identification and access control for devices on an IP network Media Access Control assigns a unique numb
34. e can be coupled directly into the target equipment via the mains power cable The interference can be transmitted from the source along the mains power cable connected to the target Interference from the mains can NSG 3040 EMC Test System reach any other piece of equipment connected to the same power source in a similar way whereby this does not all have to occur in the same section of a building Alternatively the interference can be capacitive coupled into any target device in the vicinity The test system enables a test to be erformed using both coupling methods The EUT is connected to the mains power socket on the front panel of the test system for the direct mains injection test Capacitive coupled tests require the interference to be superimposed on the EUT cable via an external coupling unit that is connected to the Burst output on the front panel of the system 3 2 Combination wave test The surge test in compliance with IEC EN 61000 4 5 duplicates high energy interference as experienced with a lightning strike Generally speaking the interference finds its way into household equipment via the low voltage mains power supply This kind of interference can affect equipment in either of two ways Firstly the interference can be coupled directly into the equipment via the mains supply The interference is conveyed directly from the source e g lightning strike to external power cables Every item of equipment connected to this p
35. e trigger signal has a duration of approx 50 us In burst and PQT testing its duration will change according to the length of the event burst or voltage dip dropout 9 2 1 Trigger signal during generation of a mains dip or mains drop out The width of the trigger signal corresponds to the width of the mains voltage variation or drop out If the Tevent is changed then the width of the trigger pulse will change accordingly 9 3 Synchronization output signal sync Between Pin 7 hi and Pin 2 8 15 20 low Inactive state At 24 V active state 2 4 V The sync signal consists of a level that goes low for each cycle of the mains frequency The reference is the signal at the power supply input EUT supply IN The position time wise of the sync signal corresponds to the specified phase angle converted into time irrespective of the supply frequency NOTE The sync signal is only active while a test is in progress and Fsync is set to sync TASEO Advanced Test Solutions for EMC 73 74 9 4 Pulse enable next step input Between Pin 17 hi and Pin 2 8 15 20 low Input open Inactive Input shorted active If this input is activated during a test run by an external device the test is halted This is the same as the pause function in the control software The test will continue to run as soon as the input is made inactive If the input is already active before a test is implemented then the test cannot start
36. ed grips ing should be retained in the event that the instrument or any of its accessories should need to be returned to a Teseq service center for repair or calibration NOTE Do not dispose of packaging materials All packag Using the following list check that all the items ordered have been delivered NSG 3040 generator User manua 1 Mains power cable for the test system 1 Dummy plug interlock blind connector 1 Ground cable to ground reference plane 1 EUT power input connector with cable 1 EUT power output connector Optional items as ordered Check the instrument for signs of transport damage Any damage should be reported to the transportation company immediately NSG 3040 EMC Test System 5 1 NSG 3040 installation 21 The mains power voltage indicated on the instrument must correspond with the local supply voltage mains voltage 85 240 VAC universal power unit mains frequency 50 60 HZ Voltage 65 255 VAC Frag range 5050 Mains switch Fuse 2x 3 15 AT W Mains power supply To insert a fuse pull the fuse holder out of the connector insert 2 x 3 15 AT slow blow into the holder and replace the holder m Plugthe mains cable into a fuse cartridges power outlet with a solid ground connection Note the polarity of all input and output connections Place the test system so that there is sufficient free space around the cooling air inlets on both sides and
37. eel sensitivity keys W wheel Surge output W start stop pause keys High frequency ground point 6 1 1 EUT output connection This is the power output connection for the EUT An EUT mains power connector to connect the EUT to the instrument is included with the system The connector contains a phase pin L Live Neutral pin N and a ground pin for the connections to the EUT The pins in the connector must be correctly wired to the corresponding conductors in the EUT power cable If the test system is connected to a DC power source for the EUT the user must ensure that the polarity at this connector corresponds with that at EUT power connector TASEO Advanced Test Solutions for EMC 24 Note For DC Power supplies L Positive N Negative The pins in the connector are designed for a maximum current of 16 A WARNING Never attempt to connect or disconnect an EUT while a test is being performed 6 1 2 High frequency ground terminal This terminal provides a solid high frequency ground connection point to the test system If an external CDN is connected then the ground strap must be connected from the CDN to the reference ground plane There is no need to connect the ground connector from the generator itself since the burst con nector provides the reference ground from the generator to the CDN NSG 3040 A A High frequency ground terminal N
38. er the MAC address to each network adapter The MAC address for the NSG 3040 network interface card displayed in the communication screen is unique to that card and cannot be changed OK Touch the button on the right side of the screen to save all settings and return to the system window EXIT Touch the Exit button on the right side of the screen to return to the system window without saving settings TASEO Advanced Test Solutions for EMC 39 40 7 6 System window Monitoring Monitoring EUT Supply Voltage NA EUT Supply Frequency Test Action St at EUT Fail Input Touching the Monitoring button in the system window allows the user to access test monitoring features 7 6 1 EUT supply voltage amp EUT supply frequency The NSG 3040 does not have EUT supply measuring features 7 6 2 Test action at EUT fail input If the EUT fail input signal is activated the action after the input can be set to The test action at EUT fail input setting allows the user to specify the action taken if the EUT stops functioning during a test If the user sets the button to Stop and the EUT fails the test will stop and the word Stop will be displayed on the touch screen The test can be restarted by pressing the Start button on the front panel If the user sets the button to Pause and the EUT fails the test will go into pause mode and the word PAUSE will be displayed on the touch
39. est Relevant safety standards Relevant EMC standards Test system for EMC tests with mains borne inter standards for burst surge and ink Ethernet TCP IP interface Pu use Bench top housing made of meta front panel Supplementary rack mounting kit ference in accordance with the IEC EN 61000 6 1 and 2 mains quality tests Operation via touch screen or software wise via a PC se output to external coupling networks Housing for bench top or rack with moulded plastic On off switch on rear panel of the instrument Power on LED yellow Pulse LED green High voltage active LED red EUT power on LED green Error LED red Main fuses interlock EUT fail input 5 to 40 C 20 to 80 relative humidity non con densing 68 to 106 kPa atmospheric air pressure Routines for functional self test IEC 61010 1 safety requirements for electrical equip ment used for measurement and control purposes as well as laboratory use IEC EN 61000 6 1 and 2 generic standards for electro magnetic interference immunity NSG 3040 EMC Test System NOTES TASEO Advanced Test Solutions for EMC 85 Headquarters Teseq AG 4542 Luterbach Switzerland T 41 32 681 40 40 F 41 32 681 40 48 sales teseq com www teseq com China Teseq Company Limited T 86 10 8460 8080 F 86 10 8460 8078 chinasales teseg com Germany Teseq GmbH T 49 30 5659
40. est pulses to the EUT mains frequency When this button is set to Asynch the phase value button in the example will display When this button is set to synch the user must also set the phase value To set the phase value touch the phase value button A red frame will be displayed around the field The phase value may be entered using the wheel or the keypad The value is in degree units and may range from 0 to 359 TASEO Advanced Test Solutions for EMC 55 8 3 7 Coupling Touch the coupling mode button EXTERNAL COUPLING in the example to select external IEC or manual coupling External coupling The burst pulses will be switched to the generator s coax output for con nection to an external coupling clamp or a 3 phase CDN IEC coupling EFT burst interference is coupled by line or a single line or multiple lines versus the reference ground plane Manual CDN This selection is for non automated external CDN like CDN 163 When IEC coupling is selected the above window is displayed Touch the indi vidual line buttons L N and PE to change the coupling setting The setting will be displayed as either and open or closed relay sign the above example shows closed relay signs for all 3 lines Burst coupling is always to the HF reference ground plane Touch the OK button to save all settings and return to the EFT burst settings window Touch the cancel button to return to the EFT burst s
41. ettings window without saving the coupling settings Touch the show graphics button to display the EFT burst graphics with the selected coupling settings NSG 3040 EMC Test System 8 3 8 Burst time Touch the Burst time button 15 in the example to set the burst time A red frame will be displayed around the field The burst time may be entered using the wheel or the keypad Touch the units button ms in the example to set the time unit Time units are s ms and spikes 8 3 9 Repetition time Touch the Repetition time button 300 in the example to set the test repetition time A red frame will be displayed around the field The repetition time may be entered using the wheel or the keypad Touch the units button ms in the example to set the time unit Time units are s and ms 8 3 10 Test duration Touch the Test duration button 120 in the example to set the test duration time A red frame will be displayed around the field The duration time may be entered using the wheel or the keypad Touch the units button s in the example to set the time unit Time units are s min h and cont continuous TASEO Advanced Test Solutions for EMC 57 58 8 3 11 Burst generator technical data Parameter Pulse amplitude Voltage step Polarity Frequency Phase Coupling Burst time Repetition time Test duration Value 200 V to 4 8 kV in 1 V steps open circuit 100 V to 2 4 kV 50
42. hnical data Mains Power Quality Teting PQT Sample graphs of voltage dips drops Setting mains PQT test parameters Voltage U Var Phase Repetition time T Event Test duration Dips amp drops value Variation test Pulsed magnetic field option Power magnetic field in conjunction with MFO System interface functions Interlock Trigger to scope output signal Trigger signal with a surge pulse Synchronization output signal sync Pulse enable next step input EUT fail input Internal coupling network Maintenance and function check General Cleaning Function check Calibration 58 58 58 59 60 60 61 61 61 62 62 63 63 64 65 65 65 66 66 66 67 67 70 70 71 72 73 73 73 74 74 75 77 77 77 78 79 TASEO Advanced Test Solutions for EMC 11 5 Warranty 79 12 CE conformity 80 13 Technical data 81 13 1 Dimensions weight 82 13 2 Options 82 13 3 Accessories for IEC EN 61000 4 11 83 13 4 Accessories for IEC EN 61000 4 8 4 9 83 14 System description 84 15 Addresses 86 WARNING Lethal danger from high voltages and the risk of radiating illegal electromagnetic interference The NSG 3040 may only be installed and used by autho rized and trained EMC specialists The NSG 3040 must only be used for EMC tests as specified in these operating instructions Personnel fitted with a heart pacemaker must not operate the instrument and must not be in the vicinity of the test setup while it is in operati
43. in the IEC EN 61000 4 8 standard Such magnetic fields may affect the operation of items of equipment that are sensitive to them The NSG 3040 performs this test by causing a current to flow in a magnetic field coil such that the current and frequency produce a proportional field within the coil parameters The magnetic field coils available as accessories are connected to the mag netic field option MFO which in turn is connected to the system 3 5 Pulsed magnetic fields option Tests with pulsed magnetic fields or PULSEM tests simulate the kind of inter ference produced by surge pulses as a result of lightning strikes to buildings and other metallic structures such as free standing masts ground conductors grounding networks etc as specified in IEC EN 61000 4 9 Magnetic fields of this type may upset the operation of installations that find themselves within such fields NSG 3040 performs this test by causing a heavy current to flow in a magnetic field coil such that the amplitude of the pulse current produce a proportional field within the coil parameters The magnetic field coils available as accessories are connected to the surge pulse output socket via the INA 752 pulse shaping network NSG 3040 EMC Test System 4 SAFETY INSTRUCTIONS mmm The NSG 3040 system and its with accessories operate at high voltages HH WARNING Improper or careless operation can be fatal These operating instructions form an essential
44. in this state EUT reports a fault to the 6 Sync2 EUT fail NSG 3040 software The est is stopped External device receives the TO trom ee 18 sync3 Trigger to Scope signal from function modue tne oscilloscope he generator slave controller and 8 master controller From external device 17 sync4 Pulse enable External Mevide SIOPS INE to the slave and mas est run ter controllers NSG 3040 EMC Test System Pin Sync line Signal Remark Working direction Freely definable synch bus Freely definable later 4 Synes signal options Freely definable synch bus Freely definable later Sync signal options Internal usage 3 Sync7 Reserved debug mode 2 8 GND 245 Sync bus ground return 15 20 y 8 Lu 24V Interbus 24 V suppl 14 21 19 Interlock return Interlock return line All Interbus lines others TASEO Advanced Test Solutions for EMC 31 32 7 TOUCH SCREEN INTERFACE mmm The NSG 3040 touch screen interface TSI consists of A7 color touch panel A wheel for setting parameters 3 wheel sensitivity keys labeled 1 10 and 100 to denote the units A start key show symbol to start tests A stop key show symbol to stop tests A pause key show symbol to pause tests CAUTION Never use a metal sharp or pointed tool for touching the panel Use a soft towel for cleaning Never use acid cleaning
45. ing the SD card WARNING Before opening the generator make sure that it is turned OFF and disconnected from all power and signal cables To open the generator the user must first remove the sides plates Each side plate has 4 snap fixtures which will separate when outward pressure is applied 1 Pull outward on the indentation in the front of the side plate shown below A blunt tool which will not scratch the paint on the panel may be used NSG 3040 EMC Test System 2 Pull outward to separate the panel from the snap fixtures 43 3 Remove the upper screws on both sides of the generator cover 4 Remove the generator cover The SD card port is located at the right front of the generator in back of the front panel Remove the upper screws on each side Lift off the cover TASEO Advanced Test Solutions for EMC 5 Press to release the SD card Remove the card from the NSG 3040 To install anew SD card proceed to step 7 6 To download new software from a PC to the SD card insert the card in the SD port of the PC and copy the software to the SD card The file name must remain SUIS000AP EXE Remove the card from the PC 7 Insert the SD card in the NSG 3040 Follow steps 1 4 in reverse to replace the generator cover and side panels SUI3000 DER File Edit View Favorites Tools ae Address F AutoCopy Program Files SUI3000 Go Folders Size Type Date Modified 5 Remov
46. international standard EN IEC 61000 4 4 The NSG 3040 generates electrical fast transients or bursts of interference that simulate the interference that is generated when inductively loaded switches are operated With their very steep rising and falling edges these interference pulses spread over a frequency spectrum of over 300 MHz and may occur wherever electrical currents are switched off in connection with motors circuit breakers relays fluorescent lamps etc Therefore nearly all the relevant stan dards concerning the testing of electronic equipment require the performance of burst tests 8 3 1 Test configuration for power line coupling In a power line coupling test the NSG 3040 generates the interference signal which is Superimposed on the EUT power signal 8 3 2 Test configuration with external coupling In an externally coupled test the interference signal is delivered through the NSG 3040 s coaxial burst output connector on the front panel and fed to an external coupling clamp The signal is then applied to signal or data line cables The same SHV type connector may also be used for connection of a 3 phase CDN or for a CDN suitable for 1 phase AC DC 16 A TASEO Advanced Test Solutions for EMC 53 Single spike Burst pulse package 100 90 V 5096 1096 t t EIE Burst Fd t LB 2096 f rep tr 5ns 30 tp 50 ns 30 into 50 Q tp 50 ns 15 n
47. liquids As soon the unit is powered and switched on the boot procedure starts approx 30 seconds and the start menu is displayed NSG 3040 EMC Test System TASEO 33 Advanced Test Solutions for ESD simulators compact user friendly and ready for tomorrow s standards contact discharge operation 200V to 30KV Erde eem n display amp Compliant with industry standards ANSI SAE 190 es ISO self test functi Loading system parameters please wait Using the wheel and sensitivity keys The wheel and sensitivity keys are used to input values in fields on the touch screen For example to enter the value 445 in a field the user must Touch the field to select it for data entry Press the 100 key and turn the wheel until the number 400 appears in the field Press the 10 key and turn the wheel until the number 440 appears in the field Press the 1 key and turn the wheel until the number 445 appears in the field 7 1 Main menu lIa3sSEO iced Test Solutions for ND RING x TELECOM WAVE N 10700 VOLTAGE E washer e VARIATION EU JUN Enn amp Bellcore rcc Na Ncc mar Following boot up the main menu displays The main menu displays all the pos Sible pulses or tests which are available to the user depending on the NSG 3040 s configuration If an option is grayed out it means that the generator is equipped to handle those pulses but the necessary equip
48. ment is not connected TASEO Advanced Test Solutions for EMC 34 A fully eqipped NSG 3040 test system typically comprises following modules EFT burst generator 5 50 ns as per IEC EN 61000 4 4 Combination wave generator 1 2 50 8 20 us as per IEC EN 61000 4 5 Voltage dropouts dips generator as per IEC EN 61000 4 11 Pulsed magnetic field as per IEC EN 61000 4 9 The empty buttons may be used for future applications In the vertical red stripe on the right side of the screen there are two buttons System and the Reset Interlock The Reset Interlock must be pressed if the interlock is open The interlock must be closed before starting a test 7 2 System window The following screen will be displayed when the System button is touched System window W Factory settings Factory settings Touching the Factory Settings button will cause the properties associated with each of the buttons in the system window to be reset to the original factory settings Exit Touch the Exit button to return to the main menu 7 3 System window General The following screen will be displayed when the user touches the General button NSG 3040 EMC Test System The user can change setting by touching the buttons on the screen to toggle 35 the values If there are no options connected to the system General settings Beeper volume On Expert mode Off FACTORY SETTINGS
49. olutions for EMC 52 KEYPAD The Keypad button is activated only when the user selects a parameter that requires a numeric entry Touching this button will display a numeric keypad The user can select numbers touch C to clear an entry and touch Enter to enter the value in the field After touching Enter the keypad will close SAVE TEST The Save Test button is used to save the current test to a file for later use When the user touches the Save Test button a keyboard is displayed The user can touch individual keys to enter a file name in the black bar above the keyboard The Del key will delete all text entered and the backspace button lt will delete the last letter entered Touching the Enter button will save the file under the name entered All letters and numbers as well as hyphens spaces and dots can be used in file names The maximum file name is 40 characters including spaces The system will automatically generate a file extension to identify the type of test For example all burst tests will be given the extension EFT Touch the cancel button to return to the test parameter window with saving the file NSG 3040 EMC Test System LONGTERM TEST LEVEL2 COUPLING ON 11 8 3 Electrical Fast Transient EFT burst testing The generation of high voltage bursts and high frequency pulses is part of the EFT burst package test required for in the
50. on When the system is used in conjunction with options accessories or other equipment the safety instructions concerning those devices must also be observed NSG 3040 EMC Test System 1 EXPLANATION OF SYMBOLS E The arrow symbol shown below indicates a note Notes are used to provide additional information that will enable the user to achieve optimal test perfor mance and efficiency Example the system is performing a test dH WARNING Never connect or disconnect the EUT while The exclamation point symbol shown below indicates a warning A warning means that injury or death as well as damage to the instruments and EUT are possible if the instructions are not obeyed Example NOTE This connection must not be confused with the EUT power input TASEO Advanced Test Solutions for EMC 8 2 INTRODUCTION E 2 1 General description The NSG 3040 test system is a multifunction generator that simulates cable borne electromagnetic interference effects for immunity testing to international national and manufacturers standards The system is designed to fulfill conducted electromagnetic compatibility EMC test requirements for compliance testing of household office light industrial or commercial equipment including combination wave surge Electrical Fast Transient EFT pulses and Power Quality Testing PQT The NSG 3040 s modular architecture and industry standard interfaces allow it to be easily e
51. or Note Uin the actual input voltage of the variac must first be set in the general screen See section 7 3 VAR 6502 double variac Uin the actual input voltage of the variac must first be set in the general screen See section 7 3 The value of Uin is variable with the double variac NSG 3040 EMC Test System Operation of the accessories 1 amp WN MO Verify the input voltage selector setting and adjust it to the correct mains voltage value if required Connect instrument power from the mains Remove 25 pin Sub D plug at rear of NSG 3040 master controller Connect this connector to X2 of the accessories Connect master controller 25 pin output to X1 plug using system interface cable delivered with the accessories Connect EUT power out to NSG 3040 EUT power input Connect EUT power in to mains using EUT power in cable delivered with NSG 3040 Switch on accessories first Switch on NSG 3040 All automated accessories will be automatically detected by the NSG 3040 firmware during the booting process For proper operation of plug and play detection it is strongly recommended to power on the accessory and then the NSG 3040 main frame Powering on the NSG 3040 main frame before the acces sories may result in non detection of accessories TASEO Advanced Test Solutions for EMC 8 7 Pulsed magnetic field option The NSG 3040 can perform pulsed magnetic field tests as required by IEC EN 61000
52. ouch panel display controls include a wheel and 3 sensivity keys to select 1 10 or 100 steps per wheel click The Start Stop and the Pause keys are used to control the test procedure All function menus and submenus of the interface are described in Standard user interface 6 2 Rear panel W Ethernet connection System interface ains power connection with on off switch and fuse Power input for the EUT 6 2 1 Mains power input The mains input is the connection point for input power for the NSG 3040 NOTE Do not confuse the mains power input with the EUT power input This input contains the mains power input connector the mains switch and the mains fuses NSG 3040 EMC Test System WARNING Before operating the NSG 3040 make sure that the voltage range shown on the mains input module corresponds with the voltage of the local supply to which the instrument will be connected and whether the fuses are correctly rated 2 x 3 15 AT 6 2 2 EUT power input WARNING Peak impulse voltages of up to 630 V can occur on these power lines Such voltages can under certain circumstances destroy DC AC power supplies It is the user s responsibility to ensure that adequate protection is provided at the source inputs The power source to this connector provides the power for the EUT Burst and surge interference signals are coupled into this supply line internally Power is also delivered via this route for PQT
53. ower source will be affected by the interference pulses Alternatively the pulses from the source of the interference or its associated mains cables can be coupled into other equipment positioned nearby Surge pulse interference can also occur on signal and data lines through cou pling effects and electrical discharges The test system enables tests to be carried out using both coupling methods The EUT is connected to the mains power socket on the front panel of the test system for the direct mains injection test Externally coupled tests require the interference to be superimposed on to the EUT power feed cable or signal data lines via an external coupling unit that is connected to the surge output on the front panel of the system TASEO Advanced Test Solutions for EMC 3 3 Mains quality test The mains quality test includes the simulation of dips and drop outs in the mains power supply in accordance with IEC EN 61000 4 11 and for DC power supplies in accordance with IEC EN 61000 4 29 A voltage dip is said to occur when the supply voltage falls considerably below the nominal level for a relatively short time e g for a few cycles whereas a drop out means that the voltage falls to zero for a similar period 3 4 Magnetic fields with mains frequency option ains frequency magnetic field tests or POWERM tests involve the simulation of the magnetic fields typically generated by the current flow in power supply cables as specified
54. part of the equipment and must be available to the operator at all times The user must obey all safety instruc tions and warnings Neither Teseq AG Luterbach Switzerland nor any of its subsidiary sales orga nizations can accept any liability for personal material or consequential injury loss or damage that may result from improper use of equipment and acces sories 4 1 General The NSG 3040 must be operated only by authorized and trained specialists The generator is to be used only for the purpose specified by the manufacturer The user is directly responsible for ensuring that the test setup does not cause excessive radiated interference which could affect other instrumentation The test system itself does not produce any excessive EM radiation However the injection of interference pulses into a EUT can result in it and or its associated cables radiating electromagnetic energy To avoid unwanted radiation the standards organizations recommend that the test setup be operated inside a Faraday cage TASEO Advanced Test Solutions for EMC WARNING Because of its construction the NSG 3040 EI is not suitable for use in an explosive atmosphere WARNING Persons fitted with a heart pacemaker must HE neither operate the instrument nor approach the test setup while a test is being executed Only approved accessores connectors adapters etc are to be used to ensure safe operation switched on This includes the function
55. rdstrasse 11F 4542 Luterbach Switzerland T 41 32 681 40 40 F 41 32 681 40 48 www teseq com Teseq AG Nordstrasse 11F 4542 Luterbach Switzerland declares that the following product NSG 3040 4 kW Multifunction Generator all conforms to the following Directives and Regulations EMC Directive 2004 108 EEC LVD Directive 2006 95 EEC EN61326 1 2005 EN61326 2 1 2005 EN61010 1 2001 The relevant technical file is available for inspection N EMC_NSG3040_2008 LVD_NSG3040_2008 Teseq AG CH 4542 Luterbach The purpose of this instrument is the generation of defined interference signals for EMI immunity testing Depending on the arrangement of the test rig the configuration the cabling and the properties of the EUT itself a significant amount of electromagnetic radiation may result that could also affect other equipment and systems The user himself or herself is ultimately responsible for the correct and controlled operation of the rig In case of doubt the tests should be carried out ina Faraday cage European representative Place and Date Teseq GmbH Landsberger Str 255 12623 Berlin Germany Luterbach May 15 2008 ml re ae Schmid President TASEO Advanced Test Solutions for EMC 82 13 TECHNICAL DATA 13 1 Dimensions weight Parameter Dimensions NSG 3040 Weight NSG 3040 13 2 Options Model CDN 3063 C32 CDN 3063 C63 CDN 8014 8015 CDN 163 CDN 117 118 CAS 3025 MD
56. s 100 ns into 1000 Q a minimum 400 MHz digital oscilloscope to accurately E A Teseq CAS 3025 calibration set must be used with verify the EFT pulse parameters 8 3 3 Setting EFT burst test parameters Touch the Burst button in the main menu to open the window shown below In this window the user can modify the following parameters Test pulse voltage frequency and phase external coupling burst time repetition time and test duration Burst Electrical Fast Transient test Volt a in 20 v Burst Time 15 Frequency 5 300 REO _ Jm Duration 7 ages ov a BE NSG 3040 EMC Test System 8 3 4 Voltage parameter Touch the polarity button ALT in the example to select test polarity Polarity values are positive POS negative NEG or alternating ALT Touch the voltage button 200 V in the example to enter the test voltage A red frame will be displayed around the field The voltage value may be entered using the wheel or the keypad 8 3 5 Frequency Touch the frequency button 5 in the example to set the test frequency A red frame will be displayed around the field The frequency value may be entered using the wheel or the keypad Touch the units button KHz in the example to set the frequency unit Fre quency values are Hz and KHz 8 3 6 Phase Touch the Synch Asynch button Asynch in the example to activate the syn chronization of t
57. s of IEC EN 61010 1 Safety requirements for electrical equipment for measurement control and laboratory use Like all mains power driven generators the system is designed for high voltage working safety in accordance with VDE 0104 nterference immunity has been tested in accordance with EN 60326 1 tis the user s responsibility to ensure that the test setup does not emit exces sive electromagnetic interference EMI which might affect other equipment The test system itself does not produce any excessive radiation however the injection of interference pulses into the EUT can result in the device and or its associated cables radiating EMI To avoid radiating unwanted interference the standards organizations recommend that the test setup be located in a Faraday cage Since the purpose of the test system is to produce interference signals for interference immunity testing the requirements in IEC EN 61000 6 1 2 3 4 concerning limiting the radiated EMI can only be complied with by operating the test system inside a Faraday cage NSG 3040 EMC Test System 4 5 Test execution WARNING The test area must be organized that no unauthorized persons have access during the execu tion of a test If a safety contact Interlock is used as a means of access control to the test zone e g a Faraday cage then an additional contact connected in series is necessary to provide protection for parts of the EUT that are likely to be touched
58. stem 8 4 5 Impedance Touch the impedance button 2 in the example to enter the imped ance A red frame will be displayed around the field The impedance value may be entered using the wheel or the keypad 8 4 6 Phase Touch the Synch Asynch button Asynch in the example to activate the syn chronization of test pulses to the EUT mains frequency When this button is set to Asynch the phase value button in the example will display When this button is set to Synch the user must also set the phase value To set the phase value touch the phase value button A red frame will be displayed around the field The phase value may be entered using the wheel or the keypad The value is in degree units and may range from 0 to 359 Synch mode is only available if the EUT power is switched on 8 4 7 Coupling Touch the coupling mode button IEC COUPLING in the example to select exter nal IEC or manual coupling External coupling The surge pulse will be switched to the generator s HV coax output for con nection to an external coupling devices but also for testing non energized EUTS also called components testing IEC coupling When IEC coupling is selected the window shown below is displayed Touch the individual line buttons L N and PE to change the coupling setting The setting will be displayed as either and open or closed relay sign TASEO Advanced Test Solutions for EMC 61 62 Manual CDN
59. t 6 3 for residen ial business and trade applications as well as small businesses Electromagnetic compatibility EMC generic stan Generic standard EN 61000 6 4 dard for interference radiation Part 6 4 industrial applications Electromagnetic compatibility EMC generic stan Generic standard 61000 6 1 dard for interference immunity Part 6 1 for residen ial business and trade applications as well as small businesses Electromagnetic compatibility EMC generic stan Generic standard EN 61000 6 2 dard for interference immunity Part 6 2 for industrial applications Product family Electrical equipment for measurements control and EN 60326 1 standard laboratory use Since the purpose of the NSG 3040 is to produce interference signals emis sions limitations can only be complied with if the generator is operated inside a Faraday cage Since CE emissions requirements cannot be fulfilled as stated in the standards deviations from these requirements are explained in appendix to the NSG 3040 s conformity declaration Deviations from the requirements are stated and explained in the appendix to the conformity declaration nterference immunity has been tested successfully as per EN 61326 1 NSG 3040 EMC Test System Declaration of conformity Manufacturer Address Product Options as Generic standards Technical file TASEO Advanced Test Solutions for EMC Teseq AG No
60. the Exit button on the right side of the screen to return to the system window without saving settings EUT OFF EUT ON Touch this button to switch the EUT power on or off Note that the EUT can work only in combination with an automated accessory such as a variac or step transformer WARNING The EUT power output is always on even if the EUT itself if switched off NSG 3040 EMC Test System RAMP VALUE 47 This button is active only if a rampable parameter is selected All rampable parameters are identified by the grey ramp sign If the parameter is ramped the ramp sign will turn red Touching the ramp button will open the window shown below that allows the user to set the parameters for automatically ramping the values of a multi step test Voltage Ramping Ramping Step Delay m3 B Start 200 Stop 4800 Step 1 Ramping mode Shows the ramping status Touching this button will change the status from static to linear In linear mode the user can set start stop and step values Start When this button is touched a red frame is displayed The user can set the start value with either the wheel or the keypad Stop When this button is touched a red frame is displayed The user can set the stop value with either the wheel or the keypad Step When this button is touched a red frame is displayed The user can set the step value with either the wheel or the keypad Step delay When this
61. ub Touch screen interface Main menu System System System window window General window Equipment System window Communications System window Monitoring EUT supply voltage amp EUT supply frequency Test action by EUT fail input System window SD card properties Using the SD card to update TSI software Removing and replacing the SD card System window Language Setting test parameters The red menu bar The bottom bar Electrical Fast Tranisient EFT burst testing Test configuration for power line coupling Test configurations with external coupling Setting EFT burst test parameters Voltage parameter Frequency Phase Coupling Burst time Repetition time 8 3 10 Test duration 8 3 11 Burst generator technical data 25 26 26 26 27 28 29 29 30 32 33 34 34 37 38 40 40 40 41 41 42 45 46 46 49 53 53 53 54 55 55 55 56 57 57 57 58 8 3 12 DTA selection window for burst 8 4 8 4 1 8 4 2 8 4 3 8 4 4 8 4 5 8 4 6 8 4 7 8 4 8 8 4 9 8 4 10 8 5 8 5 1 8 5 2 8 5 3 8 5 4 8 5 5 8 5 6 8 5 7 8 5 8 8 6 8 7 8 8 9 9 1 9 2 9 2 1 9 3 9 4 9 5 10 11 11 1 11 2 TALS 11 4 Combination wave CW surge pulse testing Test configuration for power supply line coupling Test configurations with external coupling Setting surge test parameters Voltage Impedance Phase Coupling Repetition time Test duration Combination wave generator tec
62. uit is required then the shorting connection must be made using the dummy connector Otherwise system pulse generation will be blocked An automatic EUT power on off device Circuit Breaker Option CIB is available aS an accessory This option enables the EUT power supply to be switched off since the interlock function only blocks pulse generation The interlock is a safety function and ensures that The interlock forms a bus to which all instruments in a system are connected The interlock f any part of inhibited from feature can be connected to external safety devices door contacts test enclosure hoods etc the interlock circuit is interrupted all generator modules are producing or switching high voltages The power supply to the EUT can also be switched off with the circuit breaker option Activation of this safety feature is reported to the master controller The master controller is also notified when the interlock is reset Once the interruption is over and the of the interlock has been acknowledged then power is ence signal The interlock fun restored to the EUT and the EUT is reconnected to the interfer ction is implemented in hardware so that it will not be affected by software malfunctions NSG 3040 EMC Test System 9 2 Trigger to scope output signal Between Pin 18 hi and Pin 2 8 15 20 low Inactive state At 24 V active state 2 4 V Note Th
63. xpanded and customized to meet individual testing needs The system is designed as a series of interoperable function units with a master controller that handles the real time functions and communicates with the function modules Each function unit contains a slave controller all function units are connected together through their slave controllers and networked with the central master controller via a field bus Interbus Information concern ing special features and their adjustable parameters are stored directly in the function modules NSG 3040 EMC Test System This modularity enables the function units to be combined into customized test systems and later reconfigured to address changing testing requirements The function units can be readily modified to address the requirements of new standards and new function units for new parameters may be incorporated in existing systems The NSG 3040 is controlled through its standard user interface via a touch panel display The system can also be controlled by a remote PC via its Ethernet interface To ensure optimal user and equipment safety only industry standard and cor rectly specified plugs and sockets are used throughout High voltage outputs are switch protected TASEO Advanced Test Solutions for EMC 10 3 STANDARDS AND APPLICATIONS Ml The NSG 3040 test system is designed primarily for cable borne transient inter ference tests as specified in the European generic stand
64. yed around the field The repetition time may be entered using the wheel or the keypad Touch the units button s in the example to set the time unit Time units are us ms s min and cycle 8 5 6 T Event Touch the T Event button 10 in the example to set the duration of the voltage dip or drop A red frame will be displayed around the field The T event duration time may be entered using the wheel or the keypad Touch the units button ms in the example to set the test duration T event duration options are us ms s min pulse and continuous 8 5 7 Test duration Touch the Test duration button 3 in the example to set the test duration time A red frame will be displayed around the field The duration time may be entered using the wheel or the keypad Touch the units button pulse in the example to set the test duration Test duration options are s min pulse and continuous NSG 3040 EMC Test System 8 5 8 Dips amp drops value 67 Parameter Value Dips amp drops From EUT voltage input 100 to 0 V 0 Uvar with optional variac Oto 265 V to 115 U input 16A continous to 550 A short term 10 Uvar step transformer 096 4096 7096 8096 Peak inrush current capability 500 A at 230 V Switching time 1 to 5 us 100 load Phase synchronization Asynchronous synchronous 0 to 359 in 19 steps Repetition time us 40 to 99 999 ms a 99999 SI 1 to 1 999 min 1 ue SS Cycle 11099 999 T Event

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