CSA7000 Series Serial Mask Testing & Serial Pattern Trigger and
Contents
1. Hits per segment Seg Seg2 Touch the Pass Fail Test On Off button to turn on mask Pass Fail Test pass fail testing You can touch Reset prior to running tests to clear the Pass Fail Test Summary fields ES You can also use the Pass Fail Test button in the Pass Fail Setup control window Pass Fail Test Summary Samples Tested 22000 owt of 16000 The instrument begins mask testing and displays the test summary information in the Pass Fail Test Summary fields If a mask has more than three segments the Source Status Total Hite window displays a horizontal scroll bar below the Hits Ch1 Passed 0 per Segment field that lets you scroll the field to view other segment hit data Hits per segment Source Segl Seg2 Ch1 0 0 Stop the mask 4 Touch the Pass Fail test button to turn off mask pass fail pass fail test testing Testing will also stop when the testing meets the parameters in the Pass Fail Setup control window 18 Serial Mask Testing amp Serial Pattern Trigger User Manual Reference Creating a User Mask from Refer to Mask Key Points on page 30 before creating or editing a mask To create a Defined Mask a user mask from a defined mask do the following procedure Overview Creating a user mask from a defined mask Control elements and resources Access the 1 mask setup window From the button bar touch Masks and select the Masks tab The instrument displays the Mask c2. NOTE The communications trigger standards available for an instrument depend on the bandwidth and or configuration of that instrument Table 18 AMI trigger standards Custom 32Mb 97Mb DS1 32 064 Mb s 97 728 Mb s 1 544 Mb s DS1A DSIC DS2 DS2 Rate Sym 2 048 Mb s 3 152 Mb s 6 312 Mb s 6 312 Mb s E2 DS2 Rate Coax DS3 E 6 312 Mb s 44 736 Mb s 2 048 Mb s 8 448 Mb s E3 STS 1 34 368 Mb s 51 84 Mb s Table 19 B3ZS trigger standards Custom DS3 STS 1 44 736 Mb s 51 84 Mb s Table 20 B6ZS trigger standards Custom DS2 DS2 Rate Sym 6 312 Mb s 6 312 Mb s Table 21 B8ZS trigger standards Custom DS1 DS1C DS2 Rate Coax 1 544 Mb s 3 152 Mb s 6 312 Mb s Serial Mask Testing amp Serial Pattern Trigger User Manual 45 Appendix B Supported Communication Trigger Codes and Standards 46 Table 22 CMI trigger standards Custom STM1E 155 52 Mb s DS4NA E4 139 26 Mb s 139 26 Mb s STS 3 155 52 Mb s Table 23 HDB3 trigger standards Custom E3 34 368 Mb s E1 E2 2 048 Mb s 8 448 Mb s DS1A 2 048 Mb s Table 24 MLT3 trigger standards Custom 100Base TX 125 Mb s Table 25 NRZ trigger standards Custom FC531 531 2 Mb s G2 ATA 3 0 Gb s TDS6000 only HS USB 480 Mb s OC48 STM16 2 488 Gb s 1600b 1 966 Gb s RapidlO 1 0G 1 0 Gb s SFI SPI 5 3 1G 3 1 Gb s VSR 00192 1 244 Gb s 2 5 IBand FC133 FC266 2 5 Gb s 132 8 Mb s 265 6 Mb s FC1063 FC2125E G1 ATA 1 0625 Gb s 2
3. None D81 1 544 Mb s Touch the mask standard field to display the drop down list Select DS1A 2 048 Mb s from the list if not using a la Fibre Channel DS1A signal select the standard appropriate for the 4 signal that you are using OU i eA k D52 6 312 Mis 083 44 736 Mb s DS4NA 139 26 Mb s DS4NA Max Output 189 26 Mb s STS 1 Pulse 51 84 Mbis STS 1 Eye 51 84 Mb s ST8 3 155 52 Mb s STS 3 Man Output 155 52 Mb s Teel User Masi The mask is displayed but may not be aligned with the signal Serial Mask Testing amp Serial Pattern Trigger User Manual 27 Reference Overview Creating a new mask cont Control elements and resources Align the mask 7 and the signal To align the signal with the mask touch the Alignment Setup PassiFail Results Autoset button r Display Alignment Autoset Autofit Io m Ei Config Config Config Lock Mask Hit to Wim Count E75 minimize the number of mask hits on each acquisition touch Autofit This display assumes that the autoset undo preference is off or that you touch Close to close the Autoset Undo control window ANSI T1 102 1993 R1999 DS1A 2 048 Mb s M The signal is aligned with the mask If you need to e EG D Ses esaii Hs b ines i SEDE e IM 200ns 2568s 400ps t r PER Telerance Pass Fail Setup Mask Polarity Lock Mask m l I Tolerance Select the
4. 8 In this example we are using the default source CH 1 source Source Channel AR Change the 9 Set the Mask Margin Tolerance to the percentage of tolerance margin used in the mask test this example uses the default OFF ro Mask Margin Tolerance Margins 5 0 OFF to test the signal to the selected mask standard Settings greater than 0 to expand the size of the mask segments making the test harder to pass Settings less than 0 to reduce the size of the mask segments making the test easier to pass 28 Serial Mask Testing amp Serial Pattern Trigger User Manual Reference Creating a new mask cont Control elements and resources Setup pass fail 10 Select the pass fail test controls this example uses the NEE ee ee FE testing defaults except Pass Fail Test Repeat is selected ot wins Fane com oe ompletion 20 Beep Stop Acq Beep m The number of samples or waveforms to test the il E m rg minimum number of waveforms to test and the i delay before the test begins TEM i Overview te sults Notifications actions when the test fails or completes m Polarity of the signal to test Start the test and cause the test to repeat View the test 11 View the results of the pass fail test in this example EA results there have been no hits and the current test is passing gs m Pass Fail Test Summary displays the number of samples waveforms tested
5. DM AU CUIU data in hexadecimal format touch the Format button and select Hex The editor updates the keypad for the ane selected format Ey n E mA Touch the Home button to move the insertion cursor to the left end of the pattern string Touch the left arrow or right arrow button to move the insertion cursor left or right in the pattern field You can also use the mouse or the keyboard arrow keys to move the insertion cursor Touch the Backspace button to erase the character to the left of the insertion cursor Touch the Clear button to erase all pattern data from the pattern field Touch the appropriate keypad character to enter a character You can also use the keyboard to enter binary or hexadecimal characters You can enter a maximum of 32 binary characters or 8 hexadecimal characters Apply serial 18 Touch the Apply button to apply the serial pattern to trigger pattern trigger the instrument The instrument remains in the data serial pattern data editor window Touch the Cancel button to cancel any changes since the last Apply action and return to the serial pattern trigger control window Touch the OK button to apply the current serial pattern data to the serial trigger and return to the serial pattern trigger control window Serial Mask Testing amp Serial Pattern Trigger User Manual 39 Reference 40 Serial Mask Testing amp Serial Pattern Trigger User Manual Appendix A Supported Mask
6. Selecting a mask automatically sets the instrument communications triggers to properly display most communication signals in the mask Pass Fail testing defines the mask testing parameters including the number of waveforms to test how many mask hits are allowed before failing a test setting a mask margin tolerance value and what action to perform at the completion of a test Communication triggering enables you to trigger on and display waveforms for industry standard communications signals Appendix B lists the supported standards on which you can trigger Automatic communication signal measurements enable you to make automatic measurements on communications signals Appendix C lists the available measurements Serial Mask Testing amp Serial Pattern Trigger User Manual 1 Getting Started The Serial Mask Testing key features are m Predefined masks for testing or triggering on industry standard signals such as ITU T G 703 ANSI T1 102 Fibre Channel Ethernet InfiniBand SONET Serial ATA USB IEEE 1394b and their subsets m On CSA7000 instruments optical mask standards have calibrated digital filters enabling operation as an optical reference receiver m Autoset which quickly adjusts the instrument vertical and horizontal parameters to display a waveform in a mask Autofit which positions the signal on each acquisition to minimize mask segment hits m Mask margins which allow you to adjust the default mask marg
7. Serial Mask Testing amp Serial Pattern Trigger User Manual 7 Operating Basics Accessing Serial Pattern Trigger Functions To access the Serial Pattern Trigger functions do the following steps 1 Touch the Trig tool bar button The instrument displays the Trigger control window 2 Select the A Event tab 3 Touch Serial in the Trigger Type field The instrument displays the serial pattern trigger functions as shown in Figure 4 A Serial Acquire Data Sic Coding Serial Data Level chi NRZ m Clik Sic aaa ses clk REY ETT Ethernet W Bit Rate 1 25G6bis Format Binary Serial Pattern Figure 4 Serial pattern trigger control window Table 3 describes the Serial Pattern Trigger functions Refer to the Reference chapter beginning on page 11 of this manual as well as the online help for more information about these functions Table 3 Serial trigger functions Menu Data Src Clk Src Clk Polarity Coding Standard Bit Rate Data Level Clk Level Function Sets the serial trigger waveform data source Ch1 Ch4 Sets the serial trigger clock source Ch1 Ch4 Recovered Clock the recovered clock function is not available on the TDS7104 or the TDS7054 and is only available for NRZ coded signals on the TDS6000 and TDS7000 Series instruments Sets the source waveform polarity positive or negative this function is available only when Clk Src is set to a different value than Data Src Shows the serial
8. 125 Gb s 1 5 Gb s G3 ATA GB Ethernet FS USB 6 0 Gb s 1 25 Gb s 12 Mb s TDS6000 only OC1 STMO OC3 STM1 0C12 STM4 51 84 Mb s 155 5 Mb s 622 1 Mb s OC48 FEC S400b S800b 2 666 Gb s 491 5 Mb s 983 0 Mb s XAUI RapidlO 500M RapidlO 750M 3 125 Gb s 500 Mb s 750 Mb s RapidlO 1 5G RapidlO 2 0G SFI SPI 5 2 5G 1 5 Gb s 2 0 Gb s 2 5 Gb s RIO Serial 1G RIO Serial 2G RIO Serial 3G 1 25 Gb s 2 5 Gb s 3 125 Gb s TFI 5 2 5G TFI 5 3 1G 1 488 Gb s 3 11 Gb s Serial Mask Testing amp Serial Pattern Trigger User Manual EEE EE eee Appendix C Automatic Communication Signal Measurements Table 26 lists the built in automatic communication signal measurements Table 26 Supported communications measurements and their definition Name Ext Ratio Extinction Ratio Extinction Ratio dB Eye Height Eye Width Crossing Eye Top Eye Base Jitter Pk Pk Jitter RMS Jitter 60 Noise Pk Pk Noise RMS SIN Ratio Definition The ratio of eye top to base Ext Ratio PToPmean PBaS amp mnean The ratio of eye base to top in Ext Ratio 100 PBaS mean PTOPmean The ratio of eye top to base in dB Ext Ratio dB 10 Log PTopmean PBaSenean The eye height in watts or volts Eye Height PTOPmean 3 PTOPsigma PBasemean 3 PBasesigma The eye width in seconds Eye Width TCross2nean 3 TCross2sigma TCrOSSImean 3 T Cross sigma The eye crossing point as a percentage of eye height Crossing 100 PCrosst
9. E1 L Bit Rate 2 048Mbis Touch the Standard button and select the appropriate signal standard from the list The standard selected determines the bit rate The Bit Rate field shows the bit rate for the selected Bit Rate e standard Touch the Bit Rate field and use the multipurpose knob or keypad to enter the serial data stream bit rate for nonstandard bit rates Note Changing the bit rate means the instrument is not triggering in accordance with the standard The Standard type changes to Custom when you change the bit rate value Select comm 7 Touch the Type button to select the signal type Select trigger type from Data Clock and R CIk recovered clock Recovered clock is only available for NRZ coded signals Data or clock sets the instrument to trigger on a data stream or clock signal on the input source respectively Refer to Recovered Clock R Clk Key Points on page 35 for information on the Recovered Clock function If Type is set to Clock the instrument displays the Polarity button Touch Polarity to set the clock signal polarity for the instrument to trigger on Positive or Neg ative clock edges Serial Mask Testing amp Serial Pattern Trigger User Manual 33 Reference Overview Communication triggering cont Related control elements and resources Select comm 9 Depending on the code setting the instrument displays Pulse Form trigger pulse different sets of Pulse Form button
10. Electrical masks eee 42 Table 10 InfiniBand masks eee nnn 42 Table 11 Serial ATA masks cece cece cece cece teens 42 Table 12 USB 1 1 2 0 masks eee 43 Table 13 1394b masks rasene ccc ccc ee cece ee ee teens 43 Table 14 Rapid IO LP LVDS masks eere 43 Table 15 Rapid IO Serial masks eee 43 Table 16 IOF masks 0 ccc cece cece cece nn e nn une 44 Table 17 PCI Express masks 0 ccc ccc ee eee n nnn 44 Table 18 AMI trigger standards eere 45 Table 19 B3ZS trigger standards eese 45 Table 20 B6ZS trigger standards eere 45 Table 21 B8ZS trigger standards eese 45 Table 22 CMI trigger standards eee 46 Table 23 HDB3 trigger standards eee 46 Table 24 MLT3 trigger standards eee 46 Table 25 NRZ trigger standards eese 46 Table 26 Supported communications measurements and their definition iive hex DELE IR E te RR ek 47 ii Serial Mask Testing amp Serial Pattern Trigger User Manual Preface Manual Structure Related Manuals This is the user manual for Serial Mask Testing and Serial Pattern Trigger functions The user Mask functions Mask Testing functions and Comm measurements are standard on CSA7000 Series instruments and both TDS6000 and TDS7000 Series instruments All other functio
11. T2 Values The T2 values are vertical and horizontal values associated with the rightmost crossing point These areas are used to establish the following directions m TCross2mean the horizontal mean of the right crossing point at TCross2 m TCross2sjgma gt the horizontal standard deviation of the right crossing point at TCross gt m TCross2pk pk the horizontal peak to peak deviation of the right crossing point at TCrossz DCD Values The duty cycle distortion DCD values are horizontal values associated with the rightmost crossing point at 50 of the eye height These areas are used to establish the DCDpk pk the horizontal peak to peak deviation of the left crossing point at half the height of the eye Serial Mask Testing amp Serial Pattern Trigger User Manual 49 Appendix C Automatic Communication Signal Measurements 50 Serial Mask Testing amp Serial Pattern Trigger User Manual Index A Address Tektronix v Automatic measurements levels used in taking 48 reference levels defined eye pattern optical 49 C Comm trigger 32 Communication trigger codes supported 45 Communication trigger standards supported 45 AMI 45 B3ZS 45 B6ZS 45 B8ZS 45 CMI 46 HDB3 46 MLT3 46 NRZ 46 Communications trigger 32 accessing 6 accessing the control window 36 applying the serial pattern data 39 binary format 38 39 bit rate 33 37 clock source 38 code type 33 control window access 32 display format 38 e
12. Types and Standards Tables 4 through 17 list all supported mask types and standards NOTE The standards available for an instrument depend on the bandwidth and or configuration of that instrument Table 4 ITU T masks None 32Mb 97Mb DS1 Rate 32 064 Mb s 97 728 Mb s 1 544 Mb s DS2 Rate Sym DS2 Rate Coax DS3 Rate E1 Sym Pair 6 312 Mb s 6 312 Mb s 44 736 Mb s 2 048 Mb s E1 Coax Pair E2 E3 E4 Binary 0 2 048 Mb s 8 448 Mb s 34 368 Mb s 139 26 Mb s E4 Binary 1 STM1E STM1E 139 26 Mb s Binary 0 155 52 Mb s Binary 1 155 52 Mb s Table 5 ANSI T1 102 masks None DS1 DS1A DS1C 1 544 Mb s 2 048 Mb s 3 152 Mb s DS2 DS3 DS4NA DS4NA 6 312 Mb s 44 736 Mb s 139 26 Mb s Max Output 139 26 Mb s STS 1 Pulse STS 1 Eye STS 3 STS 3 51 84 Mb s 51 84 Mb s 155 52 Mb s Max Output 155 52 Mb s Table 6 Ethernet masks None 100Base TX STP 100Base TX UTP Gigabit Ethernet 125 Mb s 125 Mb s 1 25 Gb s 1000B CX Norm TP2 1000B CX Abs TP2 1000B CX Abs TP3 XAUI Near 1 25 Gb s 1 25 Gb s 1 25 Gb s 3 125 Gb s XAUI Far 1000B SX LX 3 125 Gb s 1 25 Gb s Serial Mask Testing amp Serial Pattern Trigger User Manual 41 Appendix A Supported Mask Types and Standards 42 Table 7 SONET SDH masks None OC1 STMO OG3 STM1 OG12 STM4 OC48 STM16 51 84 Mb s 155 52 Mb s 622 08 Mb s 2 4883 Gb s OC48 FEC 2 666 Gb s Table 8 Fibre Channel masks None FC133 Optical FC266 Optical FC531 Optical 132 8 Mb s 265 6 Mb s 531 2 Mb s FC1063 Optical F
13. and instrument input channel have been tuned to have a fourth order Bessel Thompson response as well as the correct frequency response for each supported standard by use of digital filters m When the O E Electrical Out to Ch1 Input Adapter is installed you select an optical mask and the Bessel Thompson filter mode is On then only channel 1 is available Trying to turn on any other channels or perform certain functions such as changing the acquisition mode results in an error message Turning the Bessel Thompson filter mode to off enables access to the other instrument channels though channel 1 is no longer in the calibrated ORR mode m Optical signal mask testing is available for Fibre Channel InfiniBand SONET 13946 and 1G Ethernet standards m Ifa listed standard is not available on your instrument it is because the bandwidth of your instrument is not high enough to test that standard m You can use O E Adapters on different CSA7000 instruments without affecting the optical reference receiver calibration on an instrument m CSA7000 Series instruments provides recovered clock and recovered data signal outputs on the instrument front panel as well as using the signals for internal triggering Serial Mask Testing amp Serial Pattern Trigger User Manual 31 Reference Communication Comm Triggering Communication Comm triggering sets the instrument to trigger on industry standard communication signals This section de
14. ee paces a Communication Comm Triggering 0 6c cece e Serial Pattern Trigger sis man en sonata deta io a man Appendix A Supported Mask Types and Standards Appendix B Supported Communication Trigger Codes and Standards cc ccc cece cee ce cee eecevees Appendix C Automatic Communication Signal Measurements Levels Used in Taking Eye Measurements 00 e eee eee eee Index as uestes eet ka DERES ESPE SENE ON cea a ea ecu Serial Mask Testing amp Serial Pattern Trigger User Manual 45 47 48 51 Table of Contents List of Figures Figure 1 Masks control window eee 5 Figure 2 Communication signal trigger functions 6 Figure 3 Communication measurement functions 7 Figure 4 Serial pattern trigger control window 8 Figure 5 Eye diagram and optical values ceeeeeeee 48 List of Tables Table 1 Masks control window functions s 5 Table 2 Communication trigger functions Lee 6 Table 3 Serial trigger functions leere 8 Table 4 ITU T masks ccc cece cece cece HH nnn 41 Table 5 ANSI T1 102 masks cece cece ee cee cece nnn 41 Table 6 Ethernet masks 0 cc cece cece cece nnn 41 Table 7 SONET SDH masks 0 cc cece cece cece nnn 42 Table 8 Fibre Channel masks 0 cc cece cece cece sence 42 Table 9 Fibre Channel
15. instruments The Serial Pattern Trigger key features are m User defined serial data pattern of up to 32 bits on NRZ data streams up to 1 25 GBaud m Clock recovery from the serial data stream Installing Optional Serial Mask Testing and Serial Pattern Trigger Functions on TDS6000 and TDS7000 Series Instruments To enable the optional Serial Mask Testing and or Serial Triggering functions on TDS6000 and TDS7000 instruments you must have a valid Option Installation Key Do the following steps 1 N R From the oscilloscope menu bar touch the Utilities menu select Option Installation and then touch Continue Enter the authorization key using the instrument keyboard Touch Continue Reboot your instrument to enable the new option s Attach the option configuration label s on the rear panel of the instrument to indicate that the option s is installed on this instrument Serial Mask Testing amp Serial Pattern Trigger User Manual 3 Getting Started 4 Serial Mask Testing amp Serial Pattern Trigger User Manual SEE ST Operating Basics This chapter describes how to access the Serial Mask Testing and Serial Pattern Triggering features and provides a brief description of each function s settings See the Reference section in this manual for detailed instructions on using the Serial Mask Testing and Serial Pattern Triggering functions Serial Mask Testing Functions Serial Mask Testing provides three sets of fu
16. is hour Beep MM is minutes and SS is seconds ET SRO Use the Completion field buttons to set what the instrument does at the completion of a mask test out 16 Serial Mask Testing amp Serial Pattern Trigger User Manual Reference Overview To mask test a waveform cont Set test pass 18 Use the Polarity buttons to set mask and waveform and fail polarity Positive tests the positive waveform pulses parameters Negative inverts the mask and tests the negative cont waveform pulses Both tests the first half of the tested waveforms in positive polarity mode then tests the remaining waveforms in negative polarity mode 19 Toggle the Repeat button to On to set the instrument to repeat continue mask testing on the completion of each test Serial Mask Testing amp Serial Pattern Trigger User Manual Related control elements and resources Polarity Positive Negative Both Pass Fail Test 17 Reference Running a Mask Test To start and stop mask tests do the following procedure Overview Running a mask test Control elements and resources Prerequisites 1 You must have set up the instrument to perform mask testing as described in Mask Test Setup on page 12 Start the mask 2 pass fail test From the button bar touch Masks and select the I E rre tis Pass Fail Test Summary Pass Fail Results tab The instrument opens the 8000 Pass Fail Results control window
17. mask memory on the instrument Filename fomm MG Peca Files of type Lser Mask Files msk Cancel Help 24 Serial Mask Testing amp Serial Pattern Trigger User Manual Reference Creating aNew User Mask To create a new user mask that is not based on an existing mask do the following procedure Creating a new mask Set instrument 1 Use the communications trigger features to trigger the settings instrument on a signal The instrument saves these settings with the mask information Overview Control elements and resources p000 See the instrument user manual for information on displaying waveforms From the button bar touch Masks and select the Masks tab Create an empty 2 user mask Touch the User Mask button Source Tolerance Touch the mask standard field to display the drop down list User Defined Mask Select None from the list Touch the Copy Current Mask to User Mask button If you are asked if you want to overwrite the current user mask touch the Yes button Touch the Edit User Mask button The instrument displays the Mask Edit control window Serial Mask Testing amp Serial Pattern Trigger User Manual 25 Reference Overview Creating a new mask cont Control elements and resources Create and edit 8 Touch the Edit User Mask button to display the user new mask mask edit functions segments Mask El
18. trigger communications code type which is always NRZ Sets the serial trigger signal standard Sets or displays the bit rate for the selected standard Sets the data and clock source threshold levels for the selected code Serial Mask Testing amp Serial Pattern Trigger User Manual Operating Basics Table 3 Serial trigger functions cont Menu Function Editor Opens the serial pattern data editor which lets you define the serial pattern on which to trigger Format Displays the serial trigger pattern data in binary or hexadecimal format Serial Mask Testing amp Serial Pattern Trigger User Manual 9 Operating Basics 10 Serial Mask Testing amp Serial Pattern Trigger User Manual Reference This chapter contains instructions for performing the following tasks Mask Testing Mask Testing starting on this page describes how to set up and run mask tests as well as how to create edit and save user masks Communication Comm Triggering page 32 describes how to trigger on industry standard communication signals and provides information on the recovered clock R Clk feature Serial Pattern Trigger page 36 describes how to trigger on user defined serial data Mask testing sets the instrument to test industry standard communications signals against defined masks to verify the timing amplitude and waveform shape of the signal This section provides step by step instructions on how to access and operate the mask test f
19. 3 Optical 1 0625 Gb s FC1063 Optical Draft Rev 11 FC2125 0 5 Gh 5 Fibre Channel CSA7000 Series only Optical mask type standard combinations also display an optical Bessel Thompson Filter button that lets you turn on or off the fourth order Bessel Thompson frequency filter default is On When the filter is On the CSA7000 series is an Optical Reference Receiver SONET SDH CAUTION Do not exceed the maximum nondestructive optical input specified in your instrument user manual Verify that your optical input signal is within the linear operating range of the optical to electrical converter and the optical reference receiver Serial Mask Testing amp Serial Pattern Trigger User Manual 13 Reference To mask test a waveform cont Select 6 In the Masks tab touch the Display button to toggle display mask display on or off The mask must be turned on to parameters do mask testing Overview Related control elements and resources Touch the Hit Count button to turn on or off hit counting The hit count is shown in the Pass Fail Results tab Autoset Autofit Touch the Display Config button to set mask hit highlighting and to lock the mask to the waveform Lock Mask to Waveform resizes the mask to reflect changes in the horizontal or vertical settings of the instrument Lock Mask to ME This control is also on the main mask setup window Ia
20. 6 h s R Clk Format Eur Serial Pattern Data Binaryw KRKK AXKK AXARK KXXX KXXM KHXX KXXX XX01 Close 36 Serial Mask Testing amp Serial Pattern Trigger User Manual Reference Overview Serial trigger setup cont Related control elements and resources Select data 3 Touch the Data Src button to select the serial data source source Select from channel 1 through channel 4 Data Src Chi CIk Sic Chi Touch the Data Level field and use the multipurpose knob or keypad to enter the serial data stream data Serial Pattern Data Level threshold level Select serial 5 The Coding button always shows NRZ code type trigger coding Coding and standard 6 Touch the Standard button and select the appropriate standard from the list The standard selected determines NRZ the bit rate Standard FC1063 Y Bit Rate 1 0636b s The Bit Rate field shows the bit rate for the selected Bit Rate standard Touch the Bit Rate field and use the multipurpose knob or keypad to enter the serial data ES 1 066635 stream bit rate for nonstandard bit rates Note Changing the bit rate means the instrument is not triggering in accordance with the standard Serial Mask Testing amp Serial Pattern Trigger User Manual 37 Reference Overview Serial trigger setup cont Related control elements and resources Select clock 8 Touch the Clk Src button to select the serial data clock Data Sre source p
21. C1063 Optical FC2125 Optical 1 0625 Gb s Draft Rev 11 2 125 Gb s Table 9 Fibre Channel Electrical masks None FC133E Elec FC266E Elec FC531E Elec 132 8 Mb s 265 6 Mb s 531 2 Mb s FC1063E Elec FC1063E FC1063E FC1063E 1 0625 Gb s Norm Beta Transm Norm Delta Transm Norm Gamma Transm FC1063E FC1063E FC1063E FC1063E Abs Beta Transm Abs Delta Transm Abs Gamma Transm Abs Beta Recv FC1063E FC1063E FC2125E FC2125E Abs Delta Recv Abs Gamma Recv Norm Beta Transm Norm Delta Transm FC2125E FC2125E FC2125E FC2125E Norm Gamma Trans Abs Beta Transm Abs Delta Transm Abs Gamma Transm FC2125E FC2125E FC2125E Abs Beta Recv Abs Delta Recv Abs Gamma Recv Table 10 InfiniBand masks None 2 5 Optical 2 5 Gb s 2 5 Electrical 2 5 Gb s Table 11 Serial ATA masks None G1 Tx 1 5 Gb s G2 Tx 3 0 Gb s G2 Rx 3 0 Gb s TDS6000 only TDS6000 only Serial Mask Testing amp Serial Pattern Trigger User Manual Appendix A Supported Mask Types and Standards Table 12 USB 1 1 2 0 masks None HS T3 480 Mb s FS 12 Mb s HS T1 480 Mb s HS T2 480 Mb s HS T4 480 Mb s HS T5 480 Mb s HS T6 480 Mb s Table 13 1394b masks None S800b T1 983 0 Mb s 1600b T2 1 966 Gb s S400b T1 S400b T2 4008 Optical 491 5 Mb s 491 5 Mb s 491 5 Mb s S800b T2 8008 Optical S1600b T1 983 0 Mb s 983 0 Mb s 1 966 Gb s S1600 Optical 1 966 Gb s Table 14 Rapid IO LP LVDS masks None Drv 1 5 Gb
22. Serial Pattern Trigger User Manual 21 Reference Overview Editing a user mask cont Control elements and resources Add or delete a 9 Touch the Horizontal field and use the multipurpose H tal knob or keypad to change the selected vertex horizontal aos position oH 365 6ns Touch the Vertical field and use the multipurpose knob or keypad to change the selected vertex vertical position To add a vertex select the closest vertex that is clockwise from where you want to place a new vertex Touch Add to add a vertex midway between the selected vertex and the next counter clockwise vertex To delete a vertex enter or select the vertex number Save the user 11 mask to disk 22 Then touch Delete to delete the selected vertex The remaining vertices located counter clockwise from the deleted vertex are renumbered Refer to Saving a User Mask to Disk on page 23 Serial Mask Testing amp Serial Pattern Trigger User Manual Reference Saving a User Mask to To save a mask to a folder on the instrument disk do the following procedure Disk Overview Saving a user mask to disk Access the 1 Mask Setup window Control elements and resources Mask Mask Values Touch the Edit User Mask button The instrument Segment Horizontal displays the Mask Edit control window ae m Vertex Vertical EX Ediling From the button bar touch Masks and select the Masks tab Touch
23. User Manual Tektronix CSA7000 Series Serial Mask Testing amp Serial Pattern Trigger TDS6000 amp TDS7000 Series Option SM Serial Mask Testing Option ST Serial Pattern Trigger 071 1035 03 This document applies to firmware version 2 2 and above www tektronix com Copyright Tektronix Inc All rights reserved Tektronix products are covered by U S and foreign patents issued and pending Information in this publication supercedes that in all previously published material Specifications and price change privileges reserved Tektronix Inc P O Box 500 Beaverton OR 97077 0001 TEKTRONIX and TEK are registered trademarks of Tektronix Inc Table of Contents Preface vocero tee Sr are ero a Pre TS Manual Structure cepere eR ele A sed pts Ae al ee Docs Related Manuals 208 228 eve yr messa la al Heels es Contacting Tektronix 2 0 eee cece cece een een eens Getting Started eon a a E E hw ee VAN EY y aos Product Description 2 2 eeu aie Le ree rmt P he nhe Installing Optional Serial Mask Testing and Serial Pattern Trigger Functions on TDS6000 and TDS7000 Series Instruments Operating Basics cc cc ccc cece cece cere reece eee ee eee Serial Mask Testing Functions 0 0 0 cece eee cece eee eee ee Accessing Serial Pattern Trigger Functions 0 2 0 eee eee eee References 14i ese Re Ss ETT ERA d as ISN Mask Testing 2 403 pane Lena scc accanto ee ie i a eau
24. acquire a lock or may loose signal lock causing an unstable waveform display If this occurs verify that the source signal is correct and then push the LEVEL Push to set 50 front panel knob to force the instrument to reacquire a lock on the data stream W The recovered clock function is not available on TDS7054 or TDS7104 instruments Serial Mask Testing amp Serial Pattern Trigger User Manual 35 Reference Serial Pattern Trigger Serial pattern trigger sets the instrument to trigger on a user defined NRZ data stream pattern This section describes how to access and operate the serial pattern trigger function NOTE Serial pattern trigger is not available on TDS7054 or TDS7104 instru ments Serial Pattern Trigger To set the instrument to trigger on a user defined serial data stream do the Setup following procedure Serial trigger setup Access the 1 From the button bar touch Trig and select the trigger control A Event trigger tab window Overview Related control elements and resources gt B Seq BEvent Mode Edge Acquire The instrument opens the Trigger Setup control window NN So Chi v T Coupling e EN Slope Force Trigger Select serial 2 Touch the Serial button trigger The instrument displays the Serial Trigger controls Data Ste Coding Serial Pattern pus Level Im 1 ony Cik Sic Standard RCk GB Ethernet Bit Rate 1 25
25. ck 31 33 35 38 key points 35 Reference 11 Reference receivers 31 Related manuals iii S S N Ratio 48 Serial pattern trigger 36 setup 36 Serial trigger 3 36 accessing 8 bit rate 8 clk level 8 clk polarity 8 clk src 8 coding 8 control window 8 data level 8 data src 8 editor 9 format 9 functions 8 key features 3 standard 8 Service support contact information v T Technical support contact information v Tektronix contacting v U URL Tektronix v W Web site address Tektronix v 53 Index 54 Serial Mask Testing amp Serial Pattern Trigger User Manual
26. dit controls 39 edit the serial trigger pattern 39 format 38 functions 6 hexadecimal format 38 39 key points 35 level 38 mask testing 25 phase lock loop 35 polarity 38 pulse form 34 recovered clock 33 35 38 recovered clock key points 35 selecting 32 selecting a code 37 selecting a data source 37 selecting a source 32 selecting a standard 33 37 selecting a trigger 36 Serial Mask Testing amp Serial Pattern Trigger User Manual selecting a type 33 serial data 37 serial data pattern 39 serial pattern data 38 threshold level 37 threshold levels 34 view the trigger pattern 38 Contacting Tektronix v Crossing 47 Cycle Distortion 48 D Description product 1 Duty Cycle Distortion 48 E Extinction Ratio 47 Extinction Ratio 47 Extinction Ratio DB 47 Eye Base 47 Eye Height 47 Eye Top 47 Eye Width 47 G Getting started 1 Installation 3 J Jitter 6 sigma 47 Jitter Pk Pk measurement 47 Jitter RMS 47 K Key features 2 51 Index Manual structure iii Manuals related iii mask standards supported 41 Mask testing 1 11 access the setup window 19 23 24 accessing 5 accessing the edit window 21 adding a mask vertex 22 26 aligning the mask and signal 28 aligning waveform and mask 14 autofit 14 15 autofit and persistence interaction 30 autoset 13 14 autoset parameters 14 AUX OUT 16 bandwidth 31 beep 16 Bessel Thompson 31 bit
27. e Interaction The Autofit function moves the waveform vertically and horizontally in a mask to reduce the number of segment hits within a mask If persistence is set to infinite or variable each Autofit waveform movement clears existing persistence data If Autofit makes frequent waveform movements there may be little or no displayed waveform persistence data Segments and Mask Hits Each mask can have a maximum of 16 segments Segments can overlap The number of mask hits is the sum of all hits in all segments regardless of whether or not segments overlap For example if a waveform crosses over an area where two segments overlap both segments will count the waveform hit Vertices Each segment can have a maximum of 50 vertices Vertices are numbered counterclockwise with vertex one generally located at the bottom left of each segment The active selected vertex is indicated by an X The instru ment automatically assigns numbers to vertices during mask creation or editing Mask Margin Tolerance Mask margin tolerance moves the mask segment boundaries by the specified percentage Negative margins reduce the size of the segment making it easier to pass a mask test If a user defined mask has more than three segments turning on mask margins generates an error message Turning mask margin tolerance off redraws the mask segment margins to their default values but leaves the numeric value as it is allowing you to quickly toggle between defaul
28. e communications code type from a drop down menu AMI BZ3S B6ZS B8ZS CMI HDB3 MLT3 NRZ Standard Sets the signal standard for the selected code from a drop down menu Bit Rate Sets or displays the bit rate for the selected standard if you change the default bit rate the signal standard changes to Custom Comm Trigger Sets the source signal threshold levels for the selected code this function displays a single level field or Upper Lower Level upper lower level fields depending on the selected code and standard Pulse Form Sets the comm signal pulse format on which to trigger this function is displayed when required by a selected standard Accessing Serial Mask Serial Mask Testing uses the built in automatic communications measurements Testing Automatic Measurement Functions To access the communications signal automatic measurements do the following steps 1 Touch the Meas tool bar button The instrument displays the Measurement control window 2 Select the Comm tab The instrument displays the communication measure ment functions as shown in Figure 3 Measurements r Setup Display j Ext Ratio ye width ye Base Gating niri Annotation Meas 1 Y FE Figure 3 Communication measurement functions Refer to the user manual for your instrument for information on setting up and taking automatic measurements Refer to Appendix C of this manual for a list and description of the communication measurements
29. eatures The mask testing instructions cover the following subjects Mask test setup Running a mask test Creating a user mask from a defined mask Saving a user mask to disk Recalling a user mask from disk Editing a user mask Creating a new user mask Mask testing key points general and optical Serial Mask Testing amp Serial Pattern Trigger User Manual 11 Reference Mask Test Setup To set the instrument to perform mask tests do the following procedure Overview To mask test a waveform Related control elements and resources Prerequisites 1 Connect the instrument to the source signal or save the source signal to a math or reference waveform memory location Access the From the button bar touch Masks Mask Setup window Type 9 TS1235D Rev11 Display Alignment The instrument displays the Mask control window Autoset Autofit Contig Contig ITU T Fibre Chann ms EE EH mm ANSIT1 102 Fibre Elec k Ether net User Mask E Lock Mask Hit to wim Count SI S0H B Mare on om Close Select a mask 3 Select the Source tab and then the channel math or test signal reference tab and then select the waveform source to SOUrce use as the mask test source You can mask test one waveform at a time gt 1 Channel 12 Serial Mask Testing amp Serial Pattern Trigger User Manual Reference To mask test a wavefor
30. ed user mask to disk as the instrument retains the current user mask in nonvolatile memory However if you plan on creating a number of user masks you will need to store the user masks on disk as the instrument can load one user mask at a time 20 Serial Mask Testing amp Serial Pattern Trigger User Manual Reference Editing a User Mask To edit a user mask do the following procedure Overview Editing a user mask Control elements and resources Mask Mask Values Touch the Edit User Mask button The instrument stenet i displays the Mask Edit control window Access the 1 mask edit window From the button bar touch Masks and select the Masks tab Touch the User Mask button Vertical 75 0mY Enable the 4 Touch the Controls button to open the mask edit controls mask edit window on the right side of the screen This provides the controls maximum area to display the mask making editing easier Segment Selecta 5 Touch the Segment field and use the arrow buttons segment multipurpose knob or keypad to select a segment to edit The selected active segment is highlighted in red Each mask can have up to 16 segments Select a 6 Touch the Vertex field and use the arrow buttons vertex multipurpose knob or keypad to select the vertex to edit The active vertex is indicated with an X on the template segment Each segment can have up to 50 vertices Serial Mask Testing amp
31. ement Mask Values Touch the Segment field and use the arrow buttons multipurpose knob or keypad to enter or select segment 1 Vertical T Touch the Vertex Add button The instrument draws the default new segment shape a triangle Usethe instructions in Editing a User Mask starting at step 5 on page 21 to edit a segment Repeat steps 9 through 11 selecting an unused and sequential segment number to create and edit more segments Save the user Referto Saving a User Mask to Disk on page 23 mask to disk 26 Serial Mask Testing amp Serial Pattern Trigger User Manual Reference Mask Testing Example The following procedure is an example of setting up the instrument to perform mask testing on a DS1A signal This example uses a DS1A signal and a CSA7000 Instrument but the example can easily be modified for other communications signals and other instruments Overview Creating a new mask Control elements and resources Install the test 1 Connect your DS1A signal to CH 1 through suitable hookup cables probes or adapters CSA7000 Instrument Signal Source O Output S o eoo 9260 UJ 2 Press DEFAULT SETUP Set instrument 3 settings From the button bar touch Masks and select the Masks tab Touch the ANSI T1 102 button If not using an DS1A signal touch the button appropriate for the signal that you are using
32. imean PBaS mean PTOPmean PBaSemean The top of the eye The base of the eye The peak to peak value for the edge jitter in the current horizontal units Jitter PP TCrosstpp The RMS value of the edge jitter in the current horizontal units Jitter RMS TCrossigigma 6 x Jitter RMS The peak to peak value of the noise of the top or base of the signal as specified by the user Noise Pk Pk PToppk pk or PBASEpk pk The RMS value of the noise of the top or base of the signal as specified by the user Noise RMS PTopsigma or PBaSesigma Ratio of the signal amplitude to the noise of the top or base of the signal as specified by the user S N Ratio PTop PBase PTopsigma or PBasesjgma Serial Mask Testing amp Serial Pattern Trigger User Manual 47 Appendix C Automatic Communication Signal Measurements Table 26 Supported communications measurements and their definition Cont Name Definition IT Duty Cycle Distortion The peak to peak time variation of the 1st eye crossing measured at the MidRef as a percent of the eye period DCD sec 100 x TDCD _ TCross2mean TCrOSSZnean Q Quality Factor Ratio of eye size to noise Quality Factor PTopmean PBasenean PTOPsjama PBasesigma Levels Used in Taking Eye Measurements All eye diagram measurements are based on the power level the voltage level or the time locations of edges within each acquisition Figure 5 shows an eye diagram and the areas from
33. in tolerances m Pass Fail testing to continuously test a specified number of waveforms against a mask m A mask editor for creating saving and recalling user defined masks m Waveform database technology to do mask testing based on waveforms accumulated in a database rather than a single waveform stored in acquisi tion memory m Communications triggers to trigger the instrument on industry standard communications signals m Automatic measurements on communications signals m Clock recovery from the serial data stream except for TDS7104 and TDS7054 instruments NOTE If a standard or function listed in this manual is not available on your instrument it is because the configuration or bandwidth of your instrument cannot test that standard The CSA7000 Series instruments when used with the O E Electrical Out to CH1 Input Adapter 013 0327 xx are calibrated optical reference receivers with digital filtering enabling you to do mask standard compliance testing Although the TDS6000 and TDS7000 Series instruments are not calibrated optical reference receivers you can use them with mask testing to evaluate general optical signal characteristics and waveshape using an external O E converter Serial Mask Testing amp Serial Pattern Trigger User Manual Getting Started Serial Pattern Trigger Serial Pattern Trigger lets you define a serial data pattern on which to trigger the instrument not available on TDS7104 and TDS7054
34. ings 25 setup 12 29 setup window 12 signal source 12 SRQ 16 standard 13 19 standards and bandwidth 31 start testing 18 stop test 18 summary 18 system bandwidth 31 tolerance 15 28 30 triggers 29 vertex adding 26 vertices 30 waveform autofit 15 waveform resizing 14 Mask types 1394b 43 ANSI T1 102 41 Serial Mask Testing amp Serial Pattern Trigger User Manual Index Ethernet 41 Fibre Channel 42 Fibre Channel Electrical 42 InfiniBand 42 IOF 44 ITU T 41 PCI Express 44 Rapid IO LP LVDS 43 Rapid IO Serial 43 Serial ATA 42 SONET SDH 42 USB 1 2 2 0 43 Mask types supported 41 Measurement accessing 7 comm 7 Crossing 47 definitions 47 Duty Cycle Distortion 48 Extinction Ratio 47 Extinction Ratio 47 Extinction Ratio DB 47 Eye Base 47 Eye Height 47 Eye Top 47 Eye Width 47 functions 7 Jitter 6 sigma 47 Jitter Pk Pk 47 Jitter RMS 47 mask 7 Noise Pk Pk 47 Noise RMS 47 Quality Factor 48 S N Ratio 48 Measurements 47 eye measurement levels 48 levels used in taking 48 reference levels defined eye pattern optical 49 supported 47 Noise Pk Pk measurement 47 Noise RMS 47 P Phone number Tektronix v Preface iii Product description 1 Serial Mask Testing amp Serial Pattern Trigger User Manual Product support contact information v Q Q Factor 48 Quality Factor 48 R Recovered clo
35. m cont Related control elements and resources Select the mask 4 To specify the mask Type select the Masks tab Touch type the appropriate button in the Type field Touch the More button to display further selections Overview Type ITU T Fibre Channel The window lists mask types and standards that are mai is uar resten available on your instrument which depends on the AES AIG bandwidth and configuration of your instrument Ethernet Selecting a mask type and standard adjusts the instrument horizontal vertical and trigger settings to those appropriate for displaying a waveform of the specified type If the signal is not within the mask touch the Autoset button to center the waveform in a mask If Autoset did not align the signal in the mask adjust the instrument vertical and horizontal controls Is sk More m SI 0 If you touch the Autoset button and the Autoset Undo preference is On the instrument will display an Autoset Undo window Touch the Undo button to return to the previous settings or touch the Close button to remove the window Select the mask 5 To specify the mask standard select a standard from the IEEE cc ge standard drop down list Type ANSI X3 230 1999 NCITS1295D Rev11 Em FC2125 Optical 2 125 Gb 4 None ANSI T1102 Fibre Chan Elec FC133 Optical 132 8 Mb s FC266 Optical 265 62 Mbs Ethernet User Mask FC591 Optical 531 25 Mbis FC106
36. m to minimize hits The number of hits reported is the number after autofit has minimized hits Related control elements and resources Enable and set waveform autofit parameters The autofit Config button lets you set the autofit maximum waveform repositioning parameters as a percentage of the horizontal and vertical divisions uie return to default settings or return to the Mask Setup mur Autor control window Use the keypad to change the vertical or oo horizontal autofit parameters Horizontat ope Da LI 10 div Contigure limits tor minimizing mask hits Touch the Masks button to return to the Mask control window Set mask test 12 Touch the Masks Setup window Tolerance tab to set the tolerance percentage of margin used in the mask test Use the margins control knob keypad pop up keypad or up and down arrow buttons to enter the mask margin tolerance us percentage The range of values is 50 to 50 5 0 KA FS Mask Margin Tolerance Margin tolerance settings greater than 0 expand the size of the segments making the mask test harder to pass margin tolerance settings less than 0 negative percent reduces the size of the segments making the mask test easier to pass Serial Mask Testing amp Serial Pattern Trigger User Manual 15 Reference Related control elements and resources To mask test a waveform cont Set mask test 13 Select the Pass Fail Setup tab of
37. mmunication trigger functions do the Testing Communications following steps Trigger Functions 1 Touch the Trig tool bar button The instrument displays the Trigger control window 2 Select the A Event tab 3 Touch Comm in Trigger Type The instrument displays the communication signal trigger functions as shown in Figure 2 A Event A gt B Seq B Event Mode A Gomm Acquire Trigger Type Source Coding Comm Trigger Upper Level Pattern chi am vw gt gt Type Standard Ss Lower Level State Data Y Custom Y 500 0mY Bit Rate Setup Hold 1 544Mhis Pulse Form ES eye Close Figure 2 Communication signal trigger functions Table 2 describes the communication trigger functions Refer to the Reference chapter beginning on page 11 of this manual as well as the online help for more information about these functions Table 2 Communication trigger functions Menu Function Source Sets the waveform data source Ch1 Ch4 Type Sets the waveform source type Data Clock or Recovered Clock the recovered clock function is not available on the TDS7104 or the TDS7054 and is only available for NRZ coded signals Polarity Md edge positive or negative on which to trigger this function is only available when Type is set to oc Serial Mask Testing amp Serial Pattern Trigger User Manual Operating Basics Table 2 Communication trigger functions cont Menu Function Coding Sets th
38. n Dabei Mask display configuration Autoset the 9 signal In the Masks tab touch the Autoset button to have the instrument automatically adjust instrument settings to align the waveform to the mask based on the characteristics of the input signal Autoset is done on the first waveform acquired after touching the Autoset comis Conia button If the Autoset Undo preference is On the instrument will display an Autoset Undo window Touch the Undo button meer Aer to return to the previous settings or touch the Close vente d D aus button to remove the window Mem zu po s EN on Mode Position Position The Autoset Config button opens a configuration window that lets you set the vertical horizontal and trigger autoset parameters activate autofit or autoset choose the autoset mode return to the default autoset configuration or return to the Mask Setup control window DC Compensation On CSA7000 series instruments when using the O E Electrical Out to CH1 Input adapter autoset defaults to CH 1 and the instrument will ignore the other channels 14 Serial Mask Testing amp Serial Pattern Trigger User Manual Reference Overview To mask test a waveform cont 10 In the Masks tab touch the Autofit button to enable the waveform autofit function Autofit checks each waveform for any mask hits If there are hits autofit repositions the wavefor
39. nctions optical and electrical serial mask testing communications triggering and automatic communication signal measurements This section describes how to access these functions Accessing Serial Mask To access the Serial Mask Test functions touch the Masks tool bar button The Testing Functions instrument displays the Masks control window as shown in Figure 1 Source Tolerance Pass Fail Setup Pass Fail Results Type ANSI X3 230 1999 NCITS1235D Rev11 Display Alignment Fibre Channel Autoset Autofit ima FC2125 Optical 2 125 Gb s ANSIT1 102 Fibre Chan Elec Contig Config Config Br L ask m Lock Mask Hit to Wim Count Figure 1 Masks control window Table 1 describes the Masks control window tab functions Refer to the Reference chapter beginning on page 11 of this manual as well as the online help for more information about these functions Table 1 Masks control window functions Tab Function Mask Set the mask type communications standard polarity mask on off and autofit autoset alignment parameters Source Set the input waveform source Tolerance Set the mask margin tolerance values Serial Mask Testing amp Serial Pattern Trigger User Manual 5 Operating Basics Table 1 Masks control window functions cont Tab Function Pass Fail Setup Set the mask test pass fail parameters Pass Fail Results Display the pass fail test results Accessing Serial Mask To access the Serial Mask Testing co
40. ns mentioned in this document are optional for TDS6000 and TDS7000 Series instruments Serial Pattern Trigger is not available on TDS7104 and TDS7054 instruments This manual m Describes the capabilities of the Serial Mask Testing and Serial Pattern Trigger functions and how to install these functions on TDS6000 and TDS7000 instruments m Explains how to access and operate the features This manual is organized into the following chapters m Getting Started provides an overview of the Serial Mask Testing and Serial Pattern Trigger functions and shows you how to install these functions on TDS6000 and TDS7000 instruments m Operating Basics describes how to access the functions using the front panel and the instrument graphical user interface m Reference provides detailed steps for doing the most common Serial Mask Testing and Serial Pattern Trigger tasks The following table lists other documents that support the operation and service of the CSA7000 TDS6000 and TDS7000 Series instruments The part numbers of these documents are listed in the Accessories section of your instrument user manual Serial Mask Testing amp Serial Pattern Trigger User Manual iii Preface Manual name Description Online Help An online help system that is integrated with the User Interface application that ships with the CSA7000 TDS7000 and TDS6000 instruments References A quick reference to the major features of the instrument and how they ope
41. olarity source Select from channel 1 through channel 4 and and level R Clk recovered clock Recovered clock is only chi available for NRZ coded signals Clk Ste Refer to Recovered Clock R Clk Key Points on TII page 35 for information on the Recovered Clock function Clik Polarity Pos If the clock source is different than the data source serial Pattern para Level except for R Clk the instrument displays the Clk AVR Polarity button and the Clk Level field Touch Clk BEE Polarity to set the clock signal polarity to Pos itive or mE Neg ative Touch the Clk Level field and use the arrow buttons multipurpose knob or keypad to enter the clock signal threshold level View the current 10 The Serial Pattern Data field shows the current serial Format serial trigger pattern Touch the Format button to select the pattern Editor Serial Pattern Data Binary pattern display format from the drop down list Available formats 1001 ENKE HEN NE KAR OREO are binary and hexadecimal 38 Serial Mask Testing amp Serial Pattern Trigger User Manual Reference Overview Serial trigger setup cont Related control elements and resources Edit the serial 11 Touch the Editor button The instrument displays the trigger pattern Serial Trigger edit controls Editor To enter the serial data pattern in binary format touch Format Serial Pattern Data the Format button and select Binary To enter the serial Binaryw REBUILD CIBO
42. ontrol window San SNOBIRCUE RUNE TUA UE FC2125 Optical 2 125 Gb Y Eu Autoset Autofit Contig Contig Config I Lock Mask Hit to wim Count Select the mask 2 Touch the appropriate button in the Type field to select a type and mask type Touch the More button to display further standard selections ANSI T1102 Ethernet SONET SOH Select a standard from the drop down list E JER ANSI X3 230 1999 NCITS1235D Rev11 The control window lists mask types and standards that Wwe Channel FG2128 Optical 2 are available on your instrument which depend on the bandwidth and configuration of your instrument Fibre Chan Elec FC133 Optical 132 8 Mb s FC266 Optical 265 62 Mb s FC531 Optical 531 25 Mb s FC1063 Optical 1 0625 Ghis FC1063 Optical Draft Rey 11 FC2125 25 Serial Mask Testing amp Serial Pattern Trigger User Manual 19 Reference Overview Creating a user mask from a defined mask cont Control elements and resources Copy the cur 4 Touch the User Mask button rent mask MAI ANSIT1 102 Fibre Chan Elec User Defined Mask Touch the Copy Current Mask to User Mask button The instrument copies the current mask to the user mask E1 Coax Pair 2 048 Mhs t memory Edit User Mask Ma Edit the user Refer to Editing a User Mask on page 21 mask Save the user Refer to Saving a User Mask to Disk on page 23 You do mask to disk not need to save the edit
43. rate User Manual The user manual for the CSA7000 TDS7000 and TDS6000 instruments Programmer Online Guide An alphabetical listing of the programming commands and other information related to controlling the instrument over the GPIB and TekVISA interfaces Service Manual A description of how to service the instrument to the module level This optional manual must be ordered separately You can insert this user manual behind the Appendices section of your instrument user manual iv Serial Mask Testing amp Serial Pattern Trigger User Manual Preface Contacting Tektronix Serial Mask Testing amp Serial Pattern Trigger User Manual Phone Address Web site Sales support Service support Technical support 1 800 833 9200 Tektronix Inc Department or name if known 14200 SW Karl Braun Drive P O Box 500 Beaverton OR 97077 USA www tektronix com 1 800 833 9200 select option 1 1 800 833 9200 select option 2 Email techsupport tektronix com 1 800 833 9200 select option 3 6 00 a m 5 00 p m Pacific time This phone number is toll free in North America After office hours please leave a voice mail message Outside North America contact a Tektronix sales office or distributor see the Tektronix web site for a list of offices Preface vi Serial Mask Testing amp Serial Pattern Trigger User Manual Getting Started Product Description Serial Mask Testing This section of the u
44. rate 31 both polarities 17 changing the tolerance 28 completion 16 control window functions 5 copy a current mask 20 create new mask segment 26 creating a new mask 25 creating a user mask 19 creating an empty mask 25 deleting a mask vertex 22 display configuration 14 display parameters 14 easier to pass 15 edit new mask segment 26 edit user mask 26 editing a user mask 21 enable mask edit controls 21 example 27 failure 16 functions 5 harder to pass 15 hookup 27 image rescaling 14 instrument settings 27 interactions 30 key points 30 key points optical 31 log date 16 margin tolerance 15 30 margins 15 30 mask hits 30 mask type 13 52 masks directory 24 moving a mask vertex 22 negative polarity 17 number of waveforms to test 16 O E out to CHI adapter 31 optical 31 pass and fail parameters 16 polarity 17 positive polarity 17 print 16 recall mask dialog 24 recalling a user mask from disk 24 received data 31 recovered clock 31 reference receiver 31 reference receivers 31 repeat 17 reset 18 results 18 results viewing 29 running 18 samples to test 16 save mask as dialog 23 save waveform 16 saving a user mask 20 saving a user mask to disk 23 segments 26 segments and mask hits 30 selecting a mask segment 21 selecting a mask standard 19 selecting a mask vertex 21 selecting the mask type 19 selecting the source 28 setting instrument sett
45. s Ext Drv 1 0 Gb s Rev 750 Mb s Drv Drv Drv 500 Mb s 750 Mb s 1 0 Gb s Drv Ext Drv Ext Drv 2 0 Gb s 500 Mb s 750 Mb s Ext Drv Ext Drv Rev 1 5 Gb s 2 0 Gb s 500 Mb s Rev Rev Rev 1 0 Gb s 1 5 Gb s 2 0 Gb s Table 15 Rapid IO Serial masks None RIO Serial RIO Serial RIO Serial 1 25 Gb s 2 5 Gb s 3 125 Gb s Serial Mask Testing amp Serial Pattern Trigger User Manual 43 Appendix A Supported Mask Types and Standards Table 16 IOF masks None SFI SPI 5 TC Clock 2 488 Gb s SFI SPI 5 RD Clock 2 488 Gb s SFI SPI 5 TC Clock 3 125 Gb s SFI SPI 5 RD Clock 3 125 Gb s SFI SPI 5 TA Clock 2 488 Gb s SFI SPI 5 RB Clock 2 488 Gb s SFI SPI 5 TA Clock 3 125 Gb s SFI SPI 5 RB Clock 3 125 Gb s TFI 5 3 1104 Gb s SFI SPI 5 TA Data SFI SPI 5 TC Data 2 488 Gb s 2 488 Gb s SFI SPI 5 RB Data SFI SPI 5 RD Data 2 488 Gb s 2 488 Gb s SFI SPI 5 TC Data 3 125 Gb s SFI SPI 5 RB Data SFI SPI 5 RD Data 3 125 Gb s 3 125 Gb s VSR OC192 STM64 TFI 5 1 24416 Gb s 2 488 Gb s SFI SPI 5 TA Data 3 125 Gb s Table 17 PCI Express masks None 44 PCI Express Transm PCI Express Recv 2 5 Gb s 2 5 Gb s Serial Mask Testing amp Serial Pattern Trigger User Manual FEN SEE Appendix B Supported Communication Trigger Codes and Standards Tables 18 through 25 list all supported communication trigger standards Note that HDB3 B3ZS B6ZS and B8ZS are considered to be subsets of the AMI code set
46. s Touch the form appropriate Pulse form button to select a pulse form setting where each button means AMI Isolated 1 Isolated 1 and eye diagram Pulse Form CMI 1 binary 1 0 binary zero 1 inverse of Eye binary 1 and eye diagram ES EA NRZ and MLT3 eye diagram only no buttons displayed Select comm 10 Depending on the code and standard setting the trigger instrument displays the Clock Level field with one or two threshold levels threshold fields Touch each Level field and use the multipurpose knob or keypad to enter the comm signal threshold level values Camm Trigger Comm Trigger 29 Upper Level 2 0m IE Lower Level 2 0m 34 Serial Mask Testing amp Serial Pattern Trigger User Manual Reference Recovered Clock R Clk The following are key recovered clock R Clk points Key Points Recovered clock is a synchronous clock signal derived from the serial communications signal by using a Phase Lock Loop PLL clock recovery circuit m The recovered clock function only applies to NRZ source signals with a signal bit rate that is less than or equal to 2 5 Gb s The recovered clock and recovered data up to 1 25 Gb s are also available at the front panel of a CSA7000 Series instrument m When you select recovered clock the instrument attempts to trigger on and acquire a lock on the derived clock signal If the source data stream is interrupted or is very distorted then the instrument may not
47. scribes how to access and operate the communication trigger features Communication Triggering To set the instrument to trigger on communication signals do the following procedure Communication triggering Related control elements and resources Access the 1 From the button bar touch Trig and select the trigger control A Event trigger tab window Overview UE Acquire The instrument opens the Trigger Setup control window m ES c Coupling oc ov Select a com 2 Touch the Comm button munications trigger 3 A Comm Acquire The instrument displays the Comm Trigger controls Source Coding Comm Trigger Upper Level thi AM X r 2 0mv Type Standard Mi l Data Custom H Lower Level 0m Bit Rate 1 544Mh s Pulse Form EN amp Close Select comm 3 Touch the Source button to select the signal source trigger source channel Select from channel 1 through channel 4 Source Chi Type Clock Y 32 Serial Mask Testing amp Serial Pattern Trigger User Manual Reference Overview Communication triggering cont Related control elements and resources Select comm 4 Touch the Coding button and select the appropriate trigger coding code type for your signal from the list The code and standard selected determines which standards are available as well as other parameters such as trigger threshold and pulse form Coding AMI Y Standard
48. ser manual provides a high level description of the Serial Mask Testing and Serial Triggering functions The user Mask functions Mask Testing functions and Comm measurements are standard with the CSA7000 Series instruments and both TDS7000 Series Digital Phosphor Oscilloscopes and TDS6000 Series Digital Sampling Oscilloscopes All other functions mentioned in this document are optional for TDS6000 and TDS7000 Series oscilloscopes Serial Pattern Trigger is not available on TDS7104 and TDS7054 instruments This section also describes how to install Serial Mask Testing and Serial Triggering functions on TDS6000 and TDS7000 Series instruments The following text is an overview of the Serial Mask Testing and Serial Triggering features The Serial Mask Testing feature provides optical and electrical mask testing communication triggering and automatic communication signal measurements Mask testing consists of two tasks signal violation detection and pass fail testing Signal violation detection lets you test communications signals for time or amplitude violations against a predefined mask Each mask consists of one or more polygonal regions called segments The signal waveform data should stay outside of the segments defined by the mask Any signal data that occurs inside a mask segment is called a mask segment violation or hit You can select from any of the included standard telecommunications masks or you can define your own custom masks
49. t and user set margin values Serial Mask Testing amp Serial Pattern Trigger User Manual Reference Standards and Bandwidth When the instrument system bandwidth which includes the instrument attached probes and or cabling falls into the range of 1 5 to 1 8 0 8 for optical signals times the data signal bit rate the third harmonic of the data signal is significantly attenuated The instrument displays useful qualitative information but quantitative rise time measurements under these conditions may not be accurate For example a 1394b standard signal at the S800b rate has a bit rate of 983 0 Mb s 1 5 to 1 8 times this value is a range of 1 47 to 1 77 GHz Therefore you should not use a 1 5 GHz measurement system for making quantitative rise time measurements of this standard When just the instrument bandwidth falls within 1 5 1 8 0 8 for optical signals times the bit rate of a selected mask standard the instrument displays the message Consider system bandwidth when testing at this bit rate in the status area above the graticule Optical Mask Testing There are a number of optical mask test key points to be aware of prior to doing Key Points optical mask testing on the CSA7000 Series instruments 163A 000 Series Only The CSA7000 Series instruments when equipped with the O E Electrical Out to Ch1 Input Adapter are calibrated optical reference receivers This means that the instrument optical to electrical converter
50. the Masks control pass and fail parameters Overview ulte PassiFail Test Notifications Pass Fail Test Failure window samples Completion 16000 Stop Acq Beep EN Repeat Fail Thresh 1 SRO Test Delay Aub AUX Out ls Use the control knob keypad or pop up keypad to enter the number of waveforms to test number of samples in some modes the failure threshold the number of waveforms that must fail to fail the test and the delay time the time from when mask test starts to when the instrument begins sampling of Wims 20 Fail Thresh E Test Delay Use the Failure field buttons to set what the instrument does when a mask test fails have the instrument beep BEEP send an SRQ out on the GPIB bus SRQ send a trigger pulse out on the AUX OUT connector AUX Out stop signal acquisition immediately Stop Acq and or print the instrument screen image to a printer Print Save Wim Log Date Touching the More button displays more failure functions Save Wfm saves the the waveform data of the first waveform that causes the test to fail to a wim file Log Date saves time date and basic test information of the first waveform that causes the test to fail to an ASCII text txt file Both files are saved to the location specified by the Path button The file name format is YYMMDD HHMMSS Completion where YY is year MM is month DD is day HH
51. the User Mask button Save the user 4 Touch the Mask Save button mask to disk The instrument opens the Save Mask As dialog The LEN default save location is in the TekScope Masks folder Om Je gil ol sa coax mek sa mymask1 msk Enter the mask name in the File Name field The default save type is User Mask Files msk Touch Save to save the mask to disk File name 020325 204709 Save as type user Mask Files msk Cancel Auto increment file name Help Serial Mask Testing amp Serial Pattern Trigger User Manual 23 Reference Recalling a User Mask To recall a mask that was stored on disk do the following procedure From Disk Recalling a user mask From the button bar touch Masks and select the Masks tab Control elements and resources Mask Mask Values Overview Access the 1 Mask Setup window Touch the User Mask button Touch the Edit User Mask button The instrument u a displays the Mask Edit control window PE Vertical 75 0mY Recall the user 4 Touch the Mask Recall button mask from disk The instrument opens the Recall Mask dialog The Re tan default recall location is the TekScope Masks folder If Look E Masks Je Al es the mask files are in another folder use the navigation ee controls to access the appropriate folder Select the mask name Touch Recall to load the user mask into user
52. the total number of hits i SS failures and settings that you selected for the test B p m Hits per segment displays the number of hits in each segment of the mask Pass Fail Test allows you to reset the test and to turn the test on and off Triggers set 12 automatically When you turn on masks the instrument automatically sets up the triggers To see the trigger settings used by this example do the following step A Event men San Bever Mode Ban fr Comm Trigger Trigger Type Source Coding jm Trigg Upper Level From the button bar touch Trig The instrument selected M 7 We arene ls ENN Comm triggers the Ch 1 source HDB3 coding the Data To mm ERE 45064 Bit Rate type and the DS1A standard and set the bit rate and u 200006 Ise form Pulse Form Se For more 13 For additional information on setting up and using serial information mask testing refer to other sections of this user manual and the instrument online help Serial Mask Testing amp Serial Pattern Trigger User Manual 29 Reference 30 Mask Key Points There are a number of mask test key points to be aware of prior to using editing or creating a mask Mask Testing Only one mask standard is active at any time If you have a mask selected enabled and then select a new mask the new mask replaces the previous mask You cannot test to multiple standards simultaneously Autofit and Persistenc
53. which values are taken that are used to calculate measurements PTop TCross TCrossa PGross A PBase Eye Aperture Figure 5 Eye diagram and optical values 48 Serial Mask Testing amp Serial Pattern Trigger User Manual Appendix C Automatic Communication Signal Measurements P Values The P values include the mean and standard deviation of the vertical location of PTop and PBase These areas are used with a specified sample size to statistical ly measure the following values m PTopmean the mean value of PTop m PToPsigma the standard deviation of PTop m PToppk pk the vertical peak to peak deviation of PTop m PBasemean the mean value of PBase within the Eye Aperture m PBasesigma gt the standard deviation of PBase within the Eye Aperturel m PBasepk pk the vertical peak to peak deviation of PBase 1 The Eye Aperture defaults to the center 20 of the interval from TCrossj to TCross gt T1 Values The T1 values are vertical and horizontal values associated with the leftmost crossing point These areas are used to establish the following directions m TCrosslmean the horizontal mean of the left crossing point at TCross m TCross1 jgma the horizontal standard deviation of the left crossing point at TCrossj m TCross1pk pk the horizontal peak to peak deviation of the left crossing point at TCrossj m PCross1 mean the vertical mean of the left crossing point at PCross
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