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HP 16510A

1. 1 2 IE INSTALLATION Lise kp uer a ta ka uh a eR s 2 1 Behe Vx ex VIR ERE avert QNT MD 2 1 2 2 Initial Inspection LU ERE EU S ER AR MOS 2 1 2 9 Preparation FOr USO RIO AA Te ER QA ECL OD eddy 2 1 2 4 Power hRequiremenlsS xr Rer iEn TEE SO PA 2 1 2 5 Safety Requirements v oo au se ER 2 1 2 6 Probe Cable Installation rada HU PUES 2 1 2 7 2 1 2 8 Module Installation 2 2 2 9 Operating ENVITONMENE ceisir serisi is Ecenur ERE KC EE ER EUR 2 4 2 10 St ra g ven ve cid Ped bad PR a E 2 4 2 11 PACKAGING dena tici esca DR a OEC UR cen EUR UV V D RR 2 4 2 12 TAGGING FOr Service TET QUeA UI RM E Ma qa ex EE 2 4 Int PERFORMANCE TESTS ERU ad 3 1 3 12 3 1 3 2 Recommended Test Equipment 3 1 3 22 Test RECO ce
2. 6 6 9 9 Troubleshooting Flow Chart secus xr nr VERREM Ea 6 8 0 10 Endplate Overhang cakes ess sic cd er UPS MP V UR PR HM C UON 6 14 6 11 Cable Position ya e e Ea AV n FER A REEL de doute sunt e er 6 15 6 12 Endplate Overhang eerie rre n S Rr eh SE RES 6 16 5 13 Endplate Overhang 5555 Cesar RE WO ERU Y EU V KEV E ERE ES UE Ee 6 17 6 14 Card O Antistatic Mat 4949 I io X koh RERO Fai RC ee SR ur ai 6 18 6 15 Retainer And SChOWS ax cess au Ss eE ie VR RU DETUR RS UON Ces KE 6 18 6 16 COnDe6IO S sd cows a D Cru LEM LI Ub EE p Da EO 6 19 vii TABLE OF CONTENTS GENERAL INFORMATION tbs Introduction 1 1 1 2 Modules Covered Manual tax euo tele pase 1 1 159 Safety vit vaa E EA VA SEVA didis sa are ied 1 1 1245 Product Description itis ca e p a NET ee D RD 1 2 1 5 AccOsSOrles SUDDIIBU y ra ar e ha ee vive en ellc orav ER ER Rd S 1 2 1 6 Accessories Available Deka eo Gen er sede ARA E EUER ER O
3. 21 9V 10ns 1 6 CLK 1 51 3 4 120 2 ns ee 21 9 1 6V DATA 1 3V ji 40ns 16510 WF 02 86 87 Figure 3 29 Waveforms for Clock Qualifier and Data Inputs Test 7 Assign the pods under test to Analyzer 1 in Configuration screen as shown in previous test figure 3 4 Set the Format screen as figure 3 30 assigning the falling clock transition as mast er and the rising transition slave Refer to steps a through c if unfamiliar with the menus a Touch Master I Slave then Demultiplex b Assign falling clock transition to master clock and rising clock transition to slave clock Assign channels to pod under test Master Clock Slave Clock 4 Jt Pod Cl Master 1 Slave Figure 3 30 Format Screen 3 23 HP 16510A Performance Tests 5 10 3 24 Set up the Trace screen without sequencing levels as in previous test figure 3 6 but with Count Off Touch Run The Listing screen will be displayed as figure 3 31 State Timing C Listing 1 Markers Off Label gt BIT O amp O O00 o o 7 Figure 3 31 Listing Screen Disconnect the channels under test from the test connector and connect the remaining channels of the pod Repeat step 6 Disconnect the pod of data channels under test from the probe tip assembly and con nect the next pod of data ch
4. 414 tr rtt VETE OG 00 3913 11011401 11722729710 pa ee GG Gg Bg 41010171 Figure 3 37 Timing Screen Note If system clock and data synchronize glitches may be displayed on the Timing screen as valid data transition levels Disconnect channels under test and connect remaining eight channels to be tested 7 Repeat step 6 8 Disconnect pod of data channels under test from probe tip assembly and connect the next pod of data channels to be tested 9 screen and repeat steps 3 through 9 until the pods have been 5 10 Return to Configuration tested 3 29 HP 16510A Performance Tests 9 16 THRESHOLD ACCURACY TEST Description This procedure verifies the threshold accuracy within the three ranges stated in the specification Specification Threshold accuracy 150 mV accuracy over the range 2 0 to 2 0 volts 300 mV accuracy over the ranges 9 9 to 2 1 volls and 2 1 to 49 9 volts Equipment POWGI SUDDIV 55 50 PE UR eue SURE NR eee ste EDS CERE HP 6216B Test Connector 2 see figure 3 1 Procedure 1 Connect the test equipment as in figure 3 38 HP 16500A POWER LOGIC ANALYZER SUPPLY OUTPUT DATA BITS 16519 1801 8 87 Figure 3 38 Setup for Threshold Accuracy Test Note In this setup eight channels are connected to test half of the po
5. is ser 6 1 6 3 Recommended Test Equipment 6 1 6 4 Module Block Diagram and Theory Of Operation 6 1 edd say rad Dt AM dE 6 3 6 6 Troubleshoollitg RENE NE 6 7 6 7 Module Replacement uc re RN PENIS adis Du ere uis aid 6 14 6 8 Probe Cable Replacement 6 17 HP 165404 Table of Contents LIST OF TABLES TABLE TITLE 151 HP 16510A Specifications TE Cd aM 1 3 1 2 HP 16510A Operating Characteristics 1 4 1 3 Recommended Test Equipment 2 eU nnm ha rn qne e cro n 1 12 3 1 Performance Test Record DU RE de ex VE T 3 42 5 1 Reference Designators and Abbreviations 5 3 5 2 Replaceable Parts cui need NER 5 4 LIST OF ILLUSTRATIONS FIGURE TITLE PAGE 2 1 5 5552 25 case E wees 2 2 2 25 Cable POSINOM 5 Va 2
6. EON Ore cea eV HP 81614 020 OSCIIIDSCODO oy odoris i vents Re AES UM S SUD RIVA US VISTA ETE Su RN A MU AER EAE HP 54201A Power EE E 11549 50 Ohm Feedthru 2 ae 10100 Test Connectors 2 see figure 3 1 Procedure 1 Connect the HP 16510A and test equipment as in figure 3 8 HP 16500A OSCILLOSCOPE PULSE GENERATOR LOGIC ANALYZER HP 11549A 520 DATA Ill 16510 7822 10 87 Figure 3 8 Setup for Clock Qualifier Data Inputs Test 2 Note In this setup eight channels are connected to test half of the pod at a time Ground lead must be grounded to ensure accurate test results 2 HP 165104 Performance Tests Adjust pulse generator for output in figure 3 9 24 ns gt DATA AND CLK 21 9V 10ns 1 6V 51 3 Figure 3 9 Waveform for Clock Qualifier and Data Inputs Test 2 Assign the pod under test to Analyzer 1 in the Configuration screen as in previous test figure 3 4 Assign appropriate clock rising clock transition and eight channels of the pod under test to the label in the Format screen as shown in previous test figure 3 5 Set up the Trace screen without sequencing levels and set Count to Off as in figure 3 10 Sequence Levels While storing no stste TRIGGER on a 1 times Store anystate
7. 6 15 HP 165404 Service j Firmly seat bottom card into backplane connector Keep applying pressure to the center of card endplate while tightening thumb screws finger tight k Repeat for all cards and filler panels in a bottom to top order See figure 6 12 2 NEXT HIGHEST 16530 15 Figure 6 12 Endplate Overlap filler panels that are not used should be kept for future use Filler panels must be instal led in all unused card slots for correct air circulation 6 16 HP 16510A Service 6 8 PROBE CABLE REPLACEMENT CAUTION The effects of ELECTROSTATIC DISCHARGE can damage electronic com ponents Use grounded wriststraps and mats when performing any kind of service to this instrument or the cards in it PROCEDURE a Turn the insrument power switch off unplug power cord and disconnect any input output connections b Starting from the top loosen thumb screws on all filler panel s and card s C Starting from the top begin pulling all filler panel s and card s out half way See figure 6 13 CAUTION All multi card modules will be cabled together Care should be taken to pull these cards out together Cit NEXT LOWEST e 18520 1 Figure 6 13 Endplate Overhang d Pull HP 16510A State Timing Module to be serviced completely out HP 16510A Service Lay card on antistatic mat with cable s flat and pointing out to rea
8. Stores two qualified states that precede states that are stored Counts the number of qualified states between each stored state Measurement can be shown relative to the previous state or relative to trigger Maximum count is 4 4 x 1072 Measures the time between stored states relative to either the previous state or the trigger Maximum lime between states is 48 hours With tagging on the acquisition memory is halved minimum time between states is 60 ns User can define a mnemonic for the specific bit pattern of a label When data display is SYMBOL mnemonic is displayed where the bit pattern occurs Bit pattern can include Os 1s and don t cares User can define a mnemonic covering a range of values Bit pattern for lower and upper limits must be defined as a pattern of Os and 1s When data display is SYMBOL values within the specified range are displayed as mnemonic offset from base of range Number of Pattern and Range Symbols 100 per analyzer Symbols be down loaded over RS 232 C HP 165104 General Information Table 1 2 HP 16510A Operating Characteristics cont TIMING ANALYSIS TRANSITIONAL TIMING MODE Sample is stored in acquisition memory only when the data chang es A time tag stored with each sample allows reconstruction of waveform display Time covered by a full memory acquisition varies with the number of pattern changes in the data Sample Period 10 ns Maximum Time Covered By Data 500
9. Ud st xdi e dde Aid 10100 Test Connectors 2 see figure 3 1 Procedure 1 Connect the HP 16510A and test equipment as in figure 3 12 HP 16500A LOGIC ANALYZER OSCILLOSCOPE PULSE GENERATOR GND etcure EI 3 1 CLK BIT DATA BITS FIGURE 3 1 16518 T885 10 87 Figure 3 12 Setup for Clock Qualifier and Data Inputs Test 3 Note In this setup eight channels are connected to test half of the pod at a time Ground lead must be grounded to ensure accurate test results HP 165104 Performance Tests 2 Adjust the pulse generator for outputs in figure 3 13 Use double pulse mode of the pulse generator for the clock waveform 4 46ns 21 9V Le tone 1 6 CLK 1 3V 8 ns _ _ _ gt 21 be 1108 1 6 DATA 1 3V 10518 4 08 7 87 Figure 3 13 Waveforms for Clock Qualifier Data Inputs Test 3 3 Assign the pods under test to Analyzer 1 in the Configuration screen as in previous test figure 3 4 4 Assign the falling edge of the appropriate clock and eight channels to label as in previous test figure 3 5 25 Set up the Trace screen without sequencing levels and Count Off as in previous test figure 3 10 6 Touch Run The Listing screen will be displayed and alternate F s and O s will be displayed as in figure 3 14 State Timing Listing Markers ff Label BI
10. HP 16510A LOGIC ANALYSIS MODULE Service Manual Kip HEWLETT PACKARD Kip HEWLETT PACKARD SERVICE MANUAL HP 16510A 25 MHz State 100 MHz Timing Card COPYRIGHT HEWLETT PACKARD COMPANY COLORADO DIVISION 1987 1900 GARDEN OF THE GODS ROAD COLORADO SPRINGS COLORADO U S A ALL RIGHTS RESERVED Manual Part No 16510 90901 Microfiche Part No 16510 90801 PRINTED SEPTEMBER 1987 CERTIFICATION Hewlett Packard Company certifies that this product met its published specifications at the time of shipment from the factory Hewlett Packard further certifies that its calibration measurements are traceable to the United States National Bureau of Standards to the extent allowed by the Bureau s calibration facility and to the calibration facilities of other International Standards Organization members WARRANTY This Hewlett Packard product is warranted against defects in material and workmanship for a period of one year from date of shipment During the warranty period Hewlett Packard Company will at its option either repair or replace products which prove to be defective For warranty service or repair this product must be returned to a service facility designated by HP Buyer shall prepay shipping charges to HP and HP shall pay shipping charges to return the product to Buyer However Buyer shall pay all shipping charges duties and taxes for products returned to HP from another country HP warrants that its software
11. Random vibration 5 500 Hz 10 minutes per axis 2 41 g rms swept sine resonant search 5 500 Hz 0 75 g 5 minute resonant dwell 4 resonances per axis HP 165404 General information Table 1 3 Recommended Test Equipment INSTRUMENT CRITICAL SPECIFICATIONS RECOMMENDED 5 MODEL OSCILLOSCOPE dual channel HP 54201A P T to 300 MHz PULSE 5 ns pulse width HP 8161A 020 GENERATOR 20 ns period 1 3 ns risetime double pulse POWER or 10 2 V output HP 6216B SUPPLY current 0 0 4 amperes POWER 50 ohms 11549A SPLITTER to 300 MHz ADAPTER Type N male to HP 1250 0780 BNC female qty 2 ADAPTER Type N male to HP 1250 0082 BNC male 3 5 digit resolution HP 3478A P A EXTENDER No Substitute HP 16500 69004 A T BOARD 50 Ohm Qty 2 HP 10100C Feedthru x Tests A Adjustments T Troubleshooting TABLE OF CONTENTS INSTALLATION 2 1 cut PEE Ds 2 1 2 2 Initial Inspection a a pac 2 1 2 3 Preparation For USC S sre e ELE EET ES 2 1 2 4 Power Requirements vx eei et EA ER NAE Ney wenn 2 1 2 5 Safety Requirements 5 eec pru e T ERE E M Ea EE 2 1 2 6 Probe Cable Installation here CEDE a e
12. 02 5 87 Figure 3 25 Waveforms for Clock Qualifier and Data Inputs Test 6 3 Assign the pods under test to Analyzer 1 in Configuration screen as in previous test figure 3 4 4 Set up the Format screen as in figure 3 26 assigning the falling clock transition as mast er and the rising transition as slave Refer to steps a through c if unfamiliar with the menus a Touch Clock field then touch Mixed Clocks b Assign falling clock transition to master clock and rising clock transition to slave clock c Assign all channels to pod under test Master Clock Slave Clock Je Jt Pod Cl Master Slave 222 2 2222 Figure 3 26 Format Screen 3 20 HP 16510A Performance Tests 5 Set up Trace screen withoul sequencing levels as in previous test figure 3 6 but with Count Off 6 Press RUN The Listing screen will be displayed as in figure 3 27 State Timing Listing 1 Markers off Label gt 11 Base gt 71 Figure 3 27 Listing Screen 7 Disconnect the channels under test from the lest connector and connect the remaining channels 4 7 and 12 15 of the pod 8 Repeat step 6 9 Disconnect the pod of data channels under test from the probe tip assembly and con nect the next pod of data channels to be tested 10 Return to Configuration screen and repeat steps 3 through 9 until all pods have been tested with each clock 3 21 HP 16510A Performance Tests
13. 3 14 Clock Qualifier and Data Inputs Test 7 Description This performance test verifies the maximum clock rate for demultiplexed clocking during state operation Specification Clock repetition rate Single phase is 25 MHz maximum With time or state counting mini mum time between states is 60 ns Both mixed and demultiplexed clocking use master slave clock timing master clock must follow slave clock by at least 10 ns and precede the next slave clock by gt 50 ns Equipment Pulse Ge eratot HP 8161 020 54201 SO Ov FeedthrU so e nee UR 10100 Test Connectors 2 see figure 3 1 Procedure 1 Connect the HP 16510A and test equipment as in figure 3 28 by connecting channels 0 7 of the pod under test to test connector HP 16500A LOGIC ANALYZER OSCILLOSCOPE PULSE GENERATOR GND sald CLK BIT DATA BITS Frcure 3 1 16510 7895 109 87 Figure 3 28 Setup for Clock Qualifier and Data Inputs Test 7 Note In this setup eight channels are connected to test half of the pod at one time Ground lead must be grounded to ensure accurate test results 3 22 165104 Performance Tests Adjust pulse generator for the output in figure 3 29 Use double pulse mode of pulse generator for clock waveform
14. BUS INTERFACE IMB BUS 16510 8L09 Figure 6 1 HP 165104 State Timing Analyzer Block Diagram HP 16510A Service Interface And IMB The microprocessor interface circuits include the system data transceiver and the address buffers The intermodule bus circuitry IMB enables the state timing analyzer module to trigger arm other modules or be triggered armed by the state of another module in the mainframe Probes The probes are a passive design Each probe pod contains 16 data input lines which can be used for either state or timing measurements and a state clock input Each pod has a common ground for state mode and ground ing at the probe tip for timing measurements Pod Termination and Comparators Input data from the probe pods are terminated by an RC network This termination network along with the probe tips provide a 10X input attenuation Input data is then compared to a user defined threshold level If threshold levels are valid the comparators shape the data and clock signals into square waves and output them as single ended signals at ECL levels Data Acquisition Data acquisition in the state mode happens when some combination of one or more of the five state clocks match a user defined pattern The data acquisition circuits monitor the input data clocks and analyzer configuration When everything matches the analyzer will trigger and data storage begins Data acquisition in the timing mo
15. Branches Off Off Prestore off Figure 3 10 Trace Screen HP 16510A Performance Tests 6 Touch Run The Listing screen will be displayed and will list O for the channels under test as in figure 3 11 State Timing C Listing 1 Markers oft Lebel gt Base gt 19 Figure 3 11 Listing Screen 7 Disconnect the channels under test from the test connector and connect the remaining eight channels of the pod 8 Assign the remaining eight channels to the label then repeat step 6 9 Disconnect the pod of channels under test from the probe tip assembly and connect the next pod of data channels to be tested 10 Return to Configuration screen and repeat steps 3 through 9 until all pods have been tested 11 After all pods have been tested repeat steps 3 through 10 for each clock 3 8 HP 165104 Performance Tests 3 10 Clock Qualifier and Data Inputs Test 3 Description This performance test verifies the hold time specifications for the falling clock transitions of all clocks to pods 2 and 4 Specification Hold Time Data must be present after falling clock transitions 1 ns Equipment Pulse Generator esed c ice ied sii aedis HP 8161A 020 HP 54201A Power Splitter we kaw HP 11549A 5D 2
16. estere XC Rev US 4 1 INMOGUCTION ES Cx Eres by hs Yeas TE UE 4 1 4 2 Calibration Interval 666 tansy oe OO Da S ee AR Vie e RAE cbe 4 1 4 3 Safety Requirements sosesesesosseesssososoossoosasecesssossereroseseosesees 4 1 4 4 Recommended Test Equipment 4 1 4 5 Extender Board Installation anra ir d terris 4 1 4 6 Instrument Warmup aee bx rdc I acta 4 4 4 7 Adjustment And Calibration Check 4 4 Vi REPCAGCGEABLE PARTS we deve eras Deed VE pt 5 1 9 12 neus 5 1 5 2 AbBrevialofis iaces ECRIRE Rcs Ue On Ub ata 5 1 5 3 Replaceable Parts 57 eoe eE FAEERE 5 1 5 4 Ordering InformallOri Ea aha E VE CORR ES 5 1 5 5 Exchange Assemblies serisi bb ne deas eus a A RE QM Ee ad d a 5 1 5 6 Direct Mail order System eceat et te uri cs E E TEL E ERE RU C UE a E 5 2 6 1 OA 2 Initroducliofi EVA NE Pio GE MEE NA EINE 6 1 5 2 5 8
17. practice or the like which if not correctly performed or adhered to could result in personal injury Do not proceed beyond a WARNING sign until the indicated conditions are fully understood and met The CAUTION sign denotes a hazard It calls attention to an operating procedure practice or the like which if not correctiy performed or adhered to could result in damage to or destruction of part or all of the product Do not proceed beyond a CAUTION sign until the indicated conditions are fully understood or met SC1D984 HP 16510A Table of Contents SECTION l GENERAL INFORMATION 5 50 ET EE PES NIRE NN 1 1 Tate Intr duction 1 1 1 2 Modules Covered By Manual 1 1 1 3 Safety Rog irements exadasvehexs i ue enu 1 1 1 4 9 so 1 2 1 5 Accessories Supplied ex n en n ac CP LA AQUA OO DC RU RH Re 1 2 1 6 Accessories Available e ass aa arse d dax 1 2 Tet SSPPCIICAUONS Ra C 1 2 1 8 Operating Characteristics Qe es ee pu 1 2 1 9 Recommended Test Equipment
18. 031 Figure 6 3 Load Test System d From test screen in figure 6 4 touch Test System then touch State Timing If multiple state timing modules select the to be tested Test System Configuration Controller RS 232C Printer 25 nHz STATE 100 MHz TIMING Figure 6 4 Test System Screen 6 4 HP 165104 Service e Figure 6 5 is the main self test menu Self tests can be run individually by touching a specific test field or all tests automatically one time by touching All Analyzer Tests When All Analyzer Tests is run the test status will change to TESTED When in dividual tests are run the status will change to either PASSED or FAILED State Timing E Chip 1 Tests status UNTESTED Chip 2 Tests status UNTESTED Chip 3 Tests status UNTESTED Chip 4 Tests status UNTESTED Chip S Tests All Analyzer Tests status UNTESTED status UNTESTED Figure 6 5 Main Test Menu f Touch Chip 1 Tests 9 An individual test run screen see figure 6 6 will give the test name a brief description of the test number of test runs and the number of test failures State Timing E Chip 1 Tests communication 8nalyzer IC threshold This test checks the threshold memory and CPU interface for the specified state timing acquisition chip Figure 6 6 Chip 1 Tests Run Screen h Touch Run then drag finger
19. Data displayed in the Waveform screen will be all high for pod under test as in figure 3 42 Adjust power supply for output of 10 2 V Touch Run Data displayed in the Waveform screen will be all low for pod under test as in figure 3 43 Disconnect the eight channels connected to test connector and connect remaining channels of pod to be tested Repeat steps 14 through 18 and then steps 3 through 13 Disconnect pod of data channels under test from probe tip assembly and connect next pod of data channels to be tested Return to Configuration screen and repeat steps 2 through 21 until all pods have been tested HP 165104 Performance Tests 3 17 DYNAMIC RANGE TEST Description This procedure verifies the dynamic range of the threshold of each pod Specification Dynamic Range 210 volts about the threshold Equipment FOWBSF SUDDIV orderan v eR UM baa oe M 6216 Test Connector 2 see figure 3 1 Procedure 1 Connect the test equipment as in figure 3 46 HP 165 8A POWER LOGIC ANALYZER SUPPLY OUTPUT DATA BITS FIGURE 16518 1891 8 87 Figure 3 46 Setup for Dynamic Range Test Note In this setup eight channels are connected to test half of the pod at a time Ground lead must be grounded to ensure accurate test results 3 37 HP 16510A Performance Tests 2 Set up the Configuration screen for assigning of t
20. These must be observed during all phases of operation service and repair of the module Failure to comply with them violates safety standards of design manufacture and intended use of this module Hewlett Packard assumes no liability for the failure of the cus tomer to comply with these safety requirements 6 3 RECOMMENDED TEST EQUIPMENT Table 1 3 lists recommended test equipment Any equipment that satisfies the critical 16 CHANNELS PER POD INPUT DATA EXT CLKS 1 PER POD DATA BUS POD TERMINATION NETWORK AND D A CONVERTOR ANALYZER DATA 5 HP 16510 Service SECTION VI SERVICE specification given in the table may be sub stituted for the recommended models 6 4 MODULE BLOCK DIAGRAM AND THEORY OF OPERATION The following paragraphs contain block level theory of operation This theory is not intended for component level troubleshooting rather it is to be used to help isolate a module failure to card level For component level troubleshooting the HP 16510A Service Data Supplement 5 required This supplement contains schematics com ponent level theory of operation component locators and a parts list for the HP 16510A State Timing Analyzer Module The HP 16510A State Timing Module is a one board 80 channel state timing analyzer It will run timing data up to 100 MHz and state data up to 25 MHz See figure 6 1 DATA ACQUISITION IMB CONTROL
21. eS ERIS aea MS d cur hoes cues Las Sead S 3 1 9 4 Performance Test interval 2 2525 52 25 drre UTER ERE E e ves ees 3 1 3 5 Performance Test Procedures cheese see 3 1 3 60 Vat OO P RR cete s uad pu CE ORAT dV da 3 1 3 7 Clock Qualifier and Data Input 3 2 3 8 Clock Qualifier and Data Input Tests 1 3 2 3 9 Clock Qualifier and Data Input Tests 2 3 6 3 10 Clock Qualifier and Data Input Tests 3 3 9 3 11 Clock Qualifier and Data Input Tests 4 Cia a ia ater TR RE RUD WAREN 3 12 3 12 Clock Qualifier and Data Input Tests 5 3 16 3 13 Clock Qualifier and Data Input Tests 6 3 19 3 14 Clock Qualifier and Data Input Tests 7 3 22 9 15 Glitch Test ioci meh eo yee IE 3 25 3 16 Threshold Accuracy Test EE ETE E a Ux Y EE VR 3 30 3 17 Dynamic Range 9 288 dient inre TABLE OF CONTENTS HP 16510A Table of Contents TABLE OF CONTENTS SECTION PAGE IV ADJUSTMENTS veniret txt
22. filler panel s out half way See figure 4 1 TOP CARD c NEXT LOWEST 12 16530 EX13 Figure 4 1 Endplate Overlap d Pull card to be serviced completely out e Push all other cards back into card cage but not completely In so they won t be in the way for extender board installation 4 2 HP 165104 Adjustments f Slide extender board completely into card cage making sure it is firmly seated backplane connecter g Plug HP 165104 card into extender board See figure 4 2 Figure 4 2 Extender Board and Module 4 3 HP 165104 Adjustments 4 6 INSTRUMENT WARMUP Adjustments or calibration checks should be performed at the instruments environmental ambient temperature and after a 15 minute warm up 4 7 ADJUSTMENT AND CALIBRATION CHECK There is one calibration check on the HP 16510A card If calibration is out there will be one ad justment to make This adjustment is preset at the factory and normally should not need adjust ment If after referring to section 3 4 PERFORMANCE TEST INTERVAL the reference voltage is suspected as a problem perform the following procedure DESCRIPTION This procedure will check and adjust the 5 Volt reference for the D A converter EQUIPMENT DMM M M HP 3478A PROCEDURE a Connect the positive lead from the multimeter to the TP and the negative lead to the TP GND For the location of the
23. generator RX 5 Schottky clamped seconds time SCR screw silicon controlled rectifier SEC second time secondary SEG segment SEL selector SGL single SHF shift 81 zsilicon SIP zsingle in line package SKT skirt SL aslide SLDR solder SLT slot ted SOLD solenoid SPCL special square SREG zshift register SRQ sservice request STAT static STD standard SYNCHRO synchronous TA ztantalum TBAX ztubeaxial TC temperature coefficient TD time delay THD thread ed THK athick THRU through test point TPG tapping TPL triple TRANS xtransformer TRIG ztrigger ed TRMR strimmmer TRN aturn s TTL transistor transistor TX stransmitter U 10 6 UL Underwriters Laboratory UNREG unregulated VA voltampere VAC volt ac VAR variable voltage controlled oscillator VDC vertical VF voltage filtered vs versus w watts WI swith w o without ww wirewound XSTR transistor ZNR zener oc degree Celsius Centigrade OF degree Fahrenheit degree Kelvin 165104 Replaceable Parts Table 5 2 Replaceable Parts Reference HP Part Mfr Part 16510 61602 16510 61601 959 0288 16510 13501 16510 69501 01650 61608 0515 0430 0515 0665 0510 0684 16500 29101 16510 90901 16510 94301 01650 94303 16500 41201 16510 40501 16510 40502 16500 22401 2110 0003 oan OQ O ROAR PROBE CABLE SHIELOED PROB
24. performance tests may be tabulated on the Performance Test Record lable 3 1 at the end of the procedures The test record lists all of the tested specifications and their ac ceptable limits The results recorded on the test record may be used for comparison in periodic maintenance and troubleshooting or after repairs and adjustments have been made 3 4 PERFORMANCE TEST INTERVAL Periodic performance verificalion of the HP 16510A State Timing Module is required at two year intervals The instrument s performance should be verified after it has been serviced or if improper operation is suspected Further checks requiring access to the interior of the instrument are included in the adjustment sec tion but are not required for the performance verification HP 16510A Performance Tests SECTION PERFORMANCE TESTS 3 5 PERFORMANCE TEST PROCEDURES performance tests should be performed at the instruments environmental operating tem perature and after a 15 minute warm up period 3 6 TEST CONNECTOR The performance tests and adjustments require connecting pulse generator outputs to probe pod inputs Figure 3 1 is a test connec tor that may be built to allow testing of multi ple channels up to eight at one time The test connector consists of a BNC connector and a length of wire Connecting more than eight channels to the test connector at a time will induce loading of the circuit and true sig nal representation wil
25. test points and the adjustable resistor refer to figure 4 3 8 LL 77 ESL 1 E COMPONENT LOCATOR 18310 88501 REV R Figure 4 3 Adjustment Pot Location 4 4 HP 165104 Adjustments b Select a range on the multimeter that will measure as close to 5 000 Volts as possible c From the startup screen shown in figure 4 4 touch these fields in the ordered sequence below 1 System 2 State Timing If multiple HP 165104 cards pick one to be adjusted 3 Configuration 4 Format Controller RS 232C Printer Figure 4 4 Startup Screen d Touch the pod threshold field as shown in figure 4 5 Figure 4 5 Pod Threshold Field Touch User and set threshold to 9 9 Volts then touch Done 4 5 HP 16510A Adjustments With a non metallic adjustment tool adjust the variable resistor R76 until the multimeter reads 0 99 Volts 0 001 V Set user defined threshold level to 9 9 Volts Read the voltage displayed and note the difference between this reading and 0 99 Volts Adjust R76 so this difference in halved 0 001 V Examples 4 6 If reading is 0 95 V the difference is 04 V Adjust R76 for 0 97 V If reading is 0 97 V the difference is 02 V Adjust R76 for 0 98 V Turn instrument off and unplug the power cord Disconnect test equipment and remove the HP 16510A card from the extender board Remove the extender board from the mainframe To reinstall th
26. 0 ns or 0 01 resolution whichever is greater Accuracy is 0 ns to 20 ns Trigger occurs at pattern duration Less Than Duration Maximum duration is 40 ns to 10 ms with 10 ns or 0 01 resolution whichever is greater Pattern must be valid for at least 20 ns Accuracy is 20 ns to 0 ns Trigger occurs at the end of the pattern Glitch Edge Triggering Trigger on glitch or edge following valid duration of asynchronous pattern while the pattern is still present Edge can be specified as rising falling or either Less than duration forces glitch and edge triggering off 1 8 HP 165104 General Information Table 1 2 HP 16510A Operating Characteristics cont MEASUREMENT AND DISPLAY FUNCTIONS AUTOSCALE TIMING ANALYZER ONLY Autoscale searches for and displays channels with activity on the pods assigned to the timing analyzer ACQUISITION SPECIFICATIONS Arming Each analyzer can be armed by the run key the other analyzer or the Intermodule Bus Trace Mode Single mode acquires data once per trace specification repetitive mode repeats single mode acquisitions until stop is pressed or until time interval between two specified patterns is less than or greater than a specified value or within or not within a specified range There is only one trace mode when two analyzers are on LABELS Channels may be grouped together and given a six character name Up to 20 labels in each analyzer may be assigned with up to 32 chan
27. 0 seconds Minimum Time Covered by Data 10 24 GLITCH CAPTURE MODE Data sample and glitch information stored every sample period Sample Period 20 ns to 50 ms in a 1 2 5 sequence dependent on s div and delay settings i Memory Depth 512 samples channe Time Covered by Data Sample period X 512 WAVEFORM DISPLAY Sec div 10 ns to 100 s 0 01 resolution Delay 2500 5 to 2500 5 presence of data dependent the number of transitions in data between trigger and trigger plus delay transitional timing Accumulate Waveform display is not erased between successive acquisitions Overlay Mode Multiple channels can be displayed on one waveform display line Primary use is to view summary of bus activity Maximum Number Of Displayed Waveforms 24 1 7 HP 165104 General Information Table 1 2 HP 16510A Operating Characteristics cont TIME INTERVAL ACCURACY Channel to Channel Skew 4 ns typical Time Interval Accuracy sample period channel to channel skew 0 01 of time interval reading TRIGGER SPECIFICATION Asynchronous Pattern Trigger asynchronous pattern less than or greater than specified duration Pattern is the logical AND of specified low high or don t care for each assigned channel If pattern is valid but dura tion is invalid there is a 20 ns reset time before looking for patterns again Greater Than Duration Minimum duration is 30 ns to 10 ms with 1
28. 0A Table of Contents LIST OF ILLUSTRATIONS FIGURE TITLE PAGE Sree 155 04 wench aa us ewe 3 24 3 32 conan 3 25 3 33 Waveform for Glitch Test eiecit enr e hr te kedr ree ERA 3 26 3 34 OonfigurallOn Screen PE ues EARS Aa RE EAE VE RIPE E RN CE SM ENS 3 26 3 35 eens CAP s Va a 3 27 3 30 TIACE Sereen Pte 3 28 3 37 TIMING e P E La UR WERE UR esses DUE ER 3 29 3 38 Setup for Threshold Accuracy Test 3 30 3 99 Conlguralion Sereen DERE TAS dates iive RUE Oe a ote M UR E ed CENE ER VAR 3 31 3 40 Format Screen ssi cress ad a dE es 3 32 3 41 Trace Seregi PK EP 3 33 3 42 Wav form Sreem ssec Ea ERE 3 34 3 43 Wavelform PK dU CIR dC Es 3 34 3 44 Formal HOO 3 45 Format danas 3 36 3 46 Setup for Dynamic Range 2 55 55 5555555 55 nen 3 37 3 47 Configuration Screen es Pause reeds erteni virt eere Ur e E CS RR EE AVR TENEAT 3 3
29. 1 Procedure 1 Connect the HP 16510A and test equipment as in figure 3 15 HP 16500A OSCILLOSCOPE LOGIC ANALYZER PULSE GENERATOR GND Figure Z CLK BIT DATA BITS Tl rise aAMDownv 16510 7806 160 87 Figure 3 15 Setup for Clock Qualifier and Data Inputs Test 4 Note In this setup eight channels are connected to test eight channels at a time Ground lead must be grounded to ensure accurate test results 3 12 HP 16510A Performance Tests Adjust pulse generator for the output in figure 3 16 Hj 605 CLK DATA Ht 60NS 16510 W00 10 67 Figure 3 16 Waveform for Clock Qualifier and Data Inputs Test 4 Assign the pod under test to Analyzer 1 in the Configuralion screen as in figure 3 17 Refer to steps a and b if unfamiliar with menus a Touch Type field of Analyzer 1 and set to State b Assign the pod to be tested to Analyzer 1 State Timing C Configuration Analyzer 1 Analyzer 2 Unassigned Pods Figure 3 17 Configuration Screen 3 13 HP 16510A Performance Tests 4 Assign appropriate clock falling edge and eight channels of the pod under test to a label in the Format screen as shown in figure 3 18 Refer to steps a and b if unfamiliar with the menus a Touch Clock field and set appropriate clock for a falling edge b Touch Labels and turn labels on Clock L4 Pod C2 TTL Figure 3 18 Format Screen 5 Set the T
30. 3 2 3 Endplat Overlap E EUM 2 3 3 1 E COD MA 3 1 3 2 Setup for Clock Qualifier and Data Inputs Test 1 3 2 3 3 Waveform for Clock Qualifier and Data Inputs Test 1 3 3 3 4 Configuration Screen hp NR ER PEST P tau eS o DEUS 3 3 325 FORMA Scree MEE Md eR e ewes 3 4 3 6 Trace DC ER MERC 3 4 awed ene dat a See Canta qu adici C NUES me NE LE TEE RES 3 5 3 8 Setup for Clock Qualifier and Data Inputs 2 3 6 3 9 Waveform for Clock Qualifier and Data Inputs Test 2 3 7 3 10 Trace Screen veut vaa E NE iad PURSE Sevan ied Und ee qu vede died qua au ick 3 7 dst T Listing SOFOGIT er ve vibus Pa 3 8 3 12 Setup for Clock Qualifier and Data Inputs Test 3 3 9 3 13 Waveforms for Clock Qualifier and Data Inputs Test 3 3 10 3 14 Listing suisse Ses ET SO Rx Risa EI scien S QU OUT Ue gars 3 10 3 15
31. 6 Press Run then drag finger to Single Data displayed on Waveform screen will all be high for the pod under test as in figure 3 42 Accumulate Off Sample period 20 000 ns s Div Delay Markers 100 ns 0 s off Figure 3 42 Waveform Screen Ta Adjust power supply for output of 150 mV 8 Touch Run Data displayed on the Waveforin screen will be all low for the channels un der test as in figure 3 43 Accumulate Off Semple period 20 000 ns s Div Delay Markers 100 ns 0 5 Off Figure 3 43 Waveform Screen 3 34 HP 165104 Performance Tests 9 Return to the Format screen and change User defined Pod Threshold to 9 9 V as in figure 3 44 Refer to steps a and b if unfamiliar with menus a Touch Waveform then touch Format b Touch the pod threshold level assignment field and set to new level Figure 3 44 Format Screen 10 Adjust power supply for output of 10 2 V 11 Touch Run Data displayed on the Waveform screen will be all high for the pod under test as in previous fiqure 3 42 12 Adjust power supply for output of 9 6 V 13 Touch Run Data displayed on the Waveform screen will be all low as in previous figure 3 43 3 35 HP 16510A Performance Tests 14 15 16 17 18 19 20 21 22 3 36 Change the User defined Pod Threshold in the Format screen to 9 9 V as in figure 3 45 Figure 3 45 Format Screen Adjust power supply for output of 9 6 V Touch Run
32. 8 3 48 FORMAL Screem LH crop nu Pao e d RA RE aas did Qa 3 38 9449 Trac Screen DE RA VR e AREE QUE 3 39 3 50 Waveform CK Ead ada M 3 40 3 51 Waveform Screen 21 1 3 40 4 12 tone EE VR Ree Oa RA 4 2 4 1 Board Module a 4 3 433 Adjustment Pot Location 1225 c6 xoxo Ds e OO 4 4 435 Startup Sereen contenu 4 5 4 5 POG Threshold oir 400 6 1 HP 16510A State Timing Analyzer Block Diagram 6 1 6 2 STAND SCL OOM cos etes PX eek sates abalone Uu DRM E is 6 3 0 3 Load Test System roD Ce po EE Sam UR epi QUI e seeds 6 4 6 4 Test System ex RR 6 4 0 5 Main essa EXC sane Us EE RENE m EE 6 5 6 6 Chip 1 Tests RUN SCION vio x s E CU e s Me Sa Ras pd hg 6 5 6 7 StopField H M 6 6 6 8 Exit TeSt Systeri Vessel sens RENS
33. E CABLE GRABBER SET 20 HP 16510A OPER SYSTEM DISC HP 16510A EXCHANGE 55 LEAD SET GREY M3 X 6 T10 ENDPLATE SCREW M3 X 14 T10 RETAINING RING THUMBSCREW RETAINING RING GROUND SPRING SERVICE MANUAL STATE TIMING LABEL PROBE LABEL RIBBON CABLE ID CLIP CARD ENDPLATE CABLE RETAINER ENDPLATE THUMBSCREW FUSE 3 AMP 9 4 TABLE OF CONTENTS SERVICE G t 6 1 6 2 Safety Requirements 6 1 6 3 Recommended Test Equipment 6 1 6 4 Module Block Diagram and Theory Of Operation 6 1 6 5 Sall LOSES aquas e an 6 3 6 6 Troubleshooting Da mua 6 7 6 7 Module Replacement 6 14 6 8 Probe Cable 444 6 17 6 1 INTRODUCTION This section contains information for servicing the HP 16510A State Timing Analyzer Module Included is a block level theory and procedures for self diagnostics and troubleshooting If the module or a cable is determined faulty procedures are provided for module and cable replacement 6 2 SAFETY REQUIREMENTS Specific warnings cautions and instructions are placed wherever applicable throughout the manual
34. JUSTMENTS 4 1 35 EYE ES pP E ed wes 4 1 4 2 Calibration Interval eda daa 4 1 4 3 Safety Requirements I EO o OO CS rr dde as 4 1 4 4 Recommended Test Equipment 4 1 4 5 Extender Board Installation e tr rr Rr 4 1 4 0 Instrument Warmup QU UP EUR a EA EN abs Ea A 4 4 4 7 Adjustment And Calibration Check 4 4 HP 165104 Adjustments Extender Board Installation cont CAUTION The effects of ELECTROSTATIC DISCHARGE can damage electronic com ponents Grounded wriststraps and mats should be used when performing any kind of service to this module INSTALLATION CONSIDERATIONS e Any empty slots may be used in the card cage If there are other modules installed in the card cage it will be easier to use the same slot that the HP 16510A card came out of e Cards or filler panels below the slot intended for extender board installation do not have to be removed PROCEDURE a Turn instrument power switch off unplug power cord and disconnect any input connections b Starting from the top loosen thumb screws on filler panel s and card s Starting from the top begin pulling card s and
35. L Threshold Preset 1 6 volts ECL Threshold Preset 1 3 volts Threshold Range 9 9 to 9 9 volts in 0 1V increments Threshold Setting Threshold levels may be defined for pods 1 2 and 3 on an in dividual basis and one threshold may be defined for pods 4 and 5 Minimum Input Overdrive 250 mV or 30 of the input amplitude whichever is greater Maximum Voltage 40 volts peak MEASURMENT CONFIGURATIONS Analyzer Configurations Analyzer 1 Analyzer 2 Timing Off Off Timing State Off Off State Timing State State Timing State State Off Off Channel Assignment Each group of 16 channels a pod can be assigned to Analyzer 1 Analyzer 2 or remain unassigned The HP 16510A contains 5 pods 1 4 HP 16510A General Information Table 1 2 HP 16510A Operating Characteristics cont STATE ANALYSIS MEMORY Data Acquisition TRACE SPECIFICATION Clocks Clock Qualifier Pattern Recognizers Range Recognizers Qualifier Sequence Levels Branching 1024 samples channel Five clocks are available and can be used by either one or two state analyzers at any time Clock edges can be ORed together and operate in single phase two phase demultiplexing or two phase mixed mode Clock edge is selectable as positive negative or both edges for each clock The high or low level of up to four clocks can be ANDed with the clock specification Setup time 20 ns hold time 5 ns Each recognizer is the A
36. MA I I DURAM EN OUR 1 2 127 ates I vanes he Brass ata dU 1 2 1 8 Operating Characteristics 225 vie sc en RO EATER UC OD 1 2 1 9 Recommended Test Equipment 1 2 1 1 INTRODUCTION This service manual contains information for testing adjusting and servicing the HP 16510A State Timing Module Also included are installation procedures and a list of recommended test equipment This manual is divided into six sections as follows General Information ll Installation Il Performance Tests IV Adjustments V Replaceable Parts VI Service Information for operating programming and interfacing the HP 16510A State Timing Module is contained in the HP 16510A State Timing Operating and Programming Manual supplied with each module The General Information Section includes safety requirements a product description and a list of accessories supplied and of ac cessories available Also included are tables listing specifications and operating characteris tics and a list of recommended test equipment Listed on the title page of this manual is a Microfiche part number This number can be used to order 4 X 6 inch microfilm transparen cies of the manual Each microfiche contains up to 96 photo duplicates of the manual pages The microfiche package also includes the latest Manual Changes supplement as we
37. ND combination of bit 0 1 or X patterns in each label Eight pattern recognizers are available when one state analyzer is on Four are available to each analyzer when two state analyzers are on Recognizes data which is numerically between or on two specified patterns ANDed combination of Os and or 1s One range term is available and is assigned to the first state analyzer turned on The maximum size is 32 bits user specified term that be anystate nostate single pattern recognizer range recognizer or logical combination of pattern and range recognizers There are eight levels available to determine the sequence of events required for trigger The trigger term can occur anywhere in the first seven sequence levels Each sequence level has a branching qualifier When satisfied the analyzer will restart the sequence or branch to another sequence level 1 5 HP 16510A General Information Table 1 2 HP 16510A Operating Characteristics cont Occurrence Counter Storage Qualification Enable Disable Prestore TAGGING State Tagging Time Tagging SYMBOLS 1 6 Pattern Symbols Range Symbols Sequence qualifier may be specified to occur up to 65535 times before advancing to the next level Each sequence level has a storage qualifier that specifies the states that are to be stored Defines a window of post trigger storage States stored in this win dow can be qualified
38. ST EQUIPMENT Equipment required to test and maintain the HP 16510A State Timing Module is listed in table 1 3 Other equipment may be substituted if it meets or exceeds the critical specifications listed in the table HP 165104 General Information Table 1 1 HP 16510A Specifications HP 16510A SPECIFICATIONS PROBES Minimum Swing 600 mV peak to peak Threshold Accuracy Voltage Range Accuracy 2 0V to 42 0V 150 mV 9 9V to 2 1V 300 mV 2 1V to 9 9V 300 mV Dynamic Range 10 volts about the threshold STATE MODE Clock Repetition Rate Single phase is 25 MHz maximum With time or state counting minimum time between states is 60 ns Both mixed and demul tiplexed clocking use master slave clock timing master clock must follow slave clock by at least 10 ns and precede the next slave clock by gt 50 ns Clock Pulse Width 10 ns at threshold Setup Time Data must be present prior to clock transition 10 ns Hold Time Data must be present after rising clock transition on all pods 0 ns Data must be present after falling clock transition on pods 1 3 and 5 0 ns Data must be present after falling clock transition on pods 2 and 4 1 ns TIMING MODE Minimum Detectable Glitch 5 ns wide at the threshold HP 165104 General Information Table 1 2 HP 16510A Operating Characteristics HP 16510A OPERATING CHARACTERISTICS PROBES Input RC 100 2 shunted by approximately 8 pF at the probe tip TT
39. Setup for Clock Qualifier and Data Inputs Test 4 3 12 3 16 Waveforms for Clock Qualifier and Data Inputs Test 4 3 13 3 17 Config ratdon ep rama SRI RE 3 13 9 18 SCreeN a als er eas 3 14 3 19 3 14 CEA ESI 3 15 3 21 Setup for Clock Qualifier and Data Inputs Test 5 3 16 3 22 Waveforms for Clock Qualifier and Data Inputs Test 5 3 17 9 23 Listing 1 EQUES ae 3 17 3 24 Setup for Clock Qualifier and Data Inputs Test 6 3 19 3 25 Waveforms for Clock Qualifier and Data Inputs Test 6 3 20 3 25 Format Sron sores Leere ri er EE LE ua ek dA RE ELM 3 20 3 27 Listing SCORN enc RN ERE ER MUR iene ewan TEX 3 21 3 28 Setup for Clock Qualifier and Data Inputs Test 7 3 22 3 29 Waveforms for Clock Qualifier and Data Inputs Test 7 2 23 3 30 Format Screen prre 3 23 vi HP 1651
40. T 1 2 00 5 4 00 5 FF 6 00 7 FF CZE 00 9 FF 10 00 11 12 00 13 FF 14 00 15 16 00 Figure 3 14 Listing Screen 10 11 HP 16510A Performance Tests Disconnect the channels under test from the test connector and connect the remaining channels of the pod Assign the remaining eight channels to the label then repeat slep 6 Disconnect the pod of data channels under test from the probe tip assembly and connect the next pod pods 2 and 4 of data channels to be tested Return to Configuration screen and repeat steps 3 through 9 until bolh pods have been tested After pods 2 and 4 are tested repeat steps 4 through 10 with other clocks J K L M and 3 11 HP 16510A Performance Tests 3 11 Clock Qualifier and Data Inputs Test 4 Description This test verifies maximum clock rate with counting mode and the setup times for the falling edge of all clocks to pods 2 and 4 Specification Clock repetition rate With time or state counting mode on minimum time between states is 60 ns Setup time Data must be present prior to clock transition 10ns Equipment Pulse GeHnsralol ois renes ov ve PLAT HP 8161A 020 OSCINIOSCOPE JC HP 54201A Power PUES REA RE 11549 50 Ohm Eesdlhru E E as Mina ER HP 10100C Test Connectors 2 see figure 3
41. Y BE RUN INDIVIDUALLY OR ALL ANALYZER TEST DO ALL SELF TESTS PASS GO TO TROUBLESHOOTING SHEET 6 TROUBLESHOOTING SHEET 2 PERFORM THE THRESHOLD ADJUSTMENT THRESHOLD TEST FAIL 2 e o 2 2 r a 2 a REPLACE STATE TIMING CARD GO TO TROUBLESHOOTING SHEET 2 GO TO TROUBLESHOOTING SHEET 1 Figure 6 9 Troubleshooting Flow Chart cont HP 165104 Service Troubleshooting Sheet 6 FROM TROUBLESHOOTING SHEET 2 5 POSSIBLE CABLE PROBLEM CONNECT A TARGET SIGNAL SOURCE FOR PROBE TESTING OR PERFORM DATA INPUT TEST 2 IN PARAGRAPH 3 9 SEE NOTE 4 NOTE 4 YOU MAY USE YOUR OWN SIGNAL SOURCE AND MAKE A STATE OR TIMING MEASUREMENT OR PERFORM DATA INPUT TEST 2 IN PARAGRAPH 3 9 NO TROUBLE FOUND SWAP SUSPECT POD S WITH KNOWN GOOD POD S SEE NOTE 5 NOTE 5 DURING FAULT ISOLATION IT S OK TO j SWAP CABLES WITH DIFFERENT HP PART NUMBERS REDO DATA INPUT TEST 2 REPLACE CABLE S REPLACE STATE TIMING CARD 18515 T88 GO TO TROUBLESHOOTING SHEET 2 Figure 6 9 Troubleshooting Flow Chart cont 6 13 Q c a r m o 5 e o I m m HP 16510A Service 6 7 MODULE REPLACEMENT CAUTION The effects of ELECTROSTATIC DISCHARGE can damage electronic com ponents Use grounded wriststraps and mats when performing any kind of service to
42. and firmware designated by HP for use with an instrument will execute its programming instructions when properly installed on that instrument HP does not warrant that the operation of the instrument or software or firmware will be uninterrupted or error free LIMITATION OF WARRANTY The foregoing warranty shall apply to defects resulting from improper or inadequate maintenance by Buyer buyer supplied software or interfacing unauthorized modification or misuse operation outside the environmental specifications for the product or improper site preparation or maintenance NO OTHER WARRANTY IS EXPRESSED OR IMPLIED HP SPECIFICALLY DISCLAIMS THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE EXCLUSIVE REMEDIES THE REMEDIES PROVIDED HEREIN ARE BUYER S SOLE AND EXCLUSIVE REMEDIES HP SHALL NOT BE LIABLE FOR ANY DIRECT INDIRECT SPECIAL INCIDENTAL OR CONSEQUENTIAL DAMAGES WHETHER BASED ON CONTRACT TORT OR ANY OTHER LEGAL THEORY ASSISTANCE Product maintenance agreements and other customer assistance agreements are available for Hewlett Packard products For any assistance contact your nearest Hewlett Packard Sales and Service Office Addresses are provided at the back of this manual 584 SAFETY CONSIDERATIONS GENERAL This is a Safety Class Instrument provided with terminal for protective earthing OPERATION BEFORE APPLYING POWER verify that the power transformer pr
43. annels to be tested Return to Configuration screen and repeat steps 3 through 9 until all pods have been tested with each clock HP 165104 Performance Tests 3 15 GLITCH TEST Description This performance test verifies the glitch detection specification Specification Minimum detectable glitch 5 ns wide at the threshold Equipment Biles HP 8161A 020 sellos CODO xor boo sar Oe NR YR US QUEUE Ue RE eee HP 54201A 50 Ohm icem 10100 Test Connector 2 seo figure 3 1 Procedure 1 Connect the test equipment as in figure 3 32 The clock input is not used for the glitch performance test HP 16500A OSCILLOSCOPE PULSE GENERATOR LOGIC ANALYZER INPUT Q 500 16510 1592 19 87 Figure 3 32 Setup for Glitch Test Note In this setup eight channels are connected to test half of the pod at one time Ground lead must be grounded to ensure accurate test results 3 25 HP 16510A Performance Tests 2 Set pulse generator for output in figure 3 33 S 20ns 4 21 9V 5ns 1 6 DATA 1 3V 16510 wF01 Figure 3 33 Waveform for Glitch Test 3 Setup the Configuration screen for assigning of pod under test to Analyzer 1 as in figure 3 34 Refer to steps a through c if un
44. be used for repacking the module with commer cially available materials e Wrap module in anti static plastic e Use a strong shipping container double wall carton made of 350 Ib test material is adequate e Use a layer of shock absorbing material 70 to 100 mm 8 to 4 inch thick around all sides of the module to provide firm cushioning and prevent movement in side the container e Seal shipping container securely Mark shipping container FRAGILE to ensure careful handling In any correspondence refer to module by model number and board number 2 12 TAGGING FOR SERVICE If the module is to be shipped to a Hewlett Packard office for service or repair at tach a tag showing owner with address complete board number and a description of the service required TABLE OF CONTENTS PERFORMANCE TESTS C000 000000000000 0000 OO 525 D er Oe ae 3 1 Recommended Test Equipment ENSE 3 1 TeS RECOU pe ME PR TETTE 3 1 Performance Tesh Interval E iaces d ede 3 1 Performance Test Procedures 52s ec ep Nen ag Cin 3 1 TOSUCODDIOGIOI uud QUE sr CAT NAA PRODI E ees ie re 3 1 Clock Qualifier and Data Input Tests 3 2 Clock Qualifi
45. bipes da 2 1 Installation cse edes dede da CR 2 1 2 8 Module IristallallQli sus 2 2 2 9 Operating po Vv regis 2 4 2210 Strage KP Ems 2 4 Vas PACKAGING er PE 2 4 2 12 For CUP ERE ON ONE EN de E i 2 4 2 1 INTRODUCTION This section explains how to initially inspect the HP 16510A State Timing Module how to prepare it for use storage and shipment Also included are procedures for module installation 2 2 INITIAL INSPECTION Inspect the shipping container for damage If the shipping container or cushioning material is damaged it should be kept until the con tents of the shipment have been checked for completeness and the module has been checked mechanically and electrically The contents of the shipment should be as listed in the ACCESSORIES SUPPLIES paragraph lo cated in Section Procedures for checking electrical perfor mance are in Section Ill If the contents of the container are incomplete there is mechanical damage or defect or the instrument does not pass the performance tests notify the nearest Hewlett Packard office If the shipping container is damaged or the cushioning material shows signs of stress notify the carrier as well as the Hewlett Packard office Keep the shipping material so the carrier ca
46. d and demultiplexed clocking use master slave clock timing master clock must follow slave clock by at least 10 ns and precede the next slave clock by 50 ns Equipment Pulse Generator ei adde cad ee velt eate redu MV EE HP 8161A 020 356IlloS CODO HP 54201A 50 Ohm Feedthru 10100 Test Connectors 2 see figure 3 1 Procedure 1 Connect the HP 16510A and test equipment as in figure 3 24 by connecting channels 0 3 and 8 11 of the pod under test to the test connector On the slave clock transition the four bits of the lower byle are transferred to the logic analyzer and on the master clock transi tion the four bits of the upper byte are transferred to the logic analyzer HP 16500A OSCILLOSCOPE PULSE GENERATOR LOGIC ANALYZER P GND 0 5 CLK BIT DATA BITS P DATA 500 3 1 E Eum S 8 18518 885 10 87 Figure 3 24 Setup for Clock Qualifier and Data Inputs Test 6 Note In this setup eight channels are connected to test half of the pod at one time Ground lead must be grounded to ensure accurate test results 3 19 HP 165104 Performance Tests 2 Adjust pulse generator for the output in figure 3 25 Use double pulse mode of the pulse generator for clock waveform It 66ns 21 9V 10ns 1 6V CLK S1 3V 6 40ns 16510
47. d at a time Ground lead must be grounded to ensure accurate test results 3 30 HP 16510A Performance Tests 2 Setup the Configuration screen for assigning pod under test to Analyzer 1 as in figure 3 39 Follow steps a and b if unfamiliar with menus a Select Configuration screen b Assign pod under test to Analyzer 1 State Timing C Configuration Analyzer 2 Analyzer 1 MACHINE 1 Timing Unassigned Pods Figure 3 39 Configuration Screen 3 31 HP 165404 Performance Tests 3 Configure the Format screen for User defined pod threshold of 0 0 V for the pod under test and assign all bits of the pod to a label as in figure 3 40 Refer to steps a through c if unfamiliar with menus a Select Format screen b Assign User defined pod threshold c Assign all bits of pod under test to label Figure 3 40 Format Screen 3 32 HP 16510A Performance Tests 4 Configure the Trace screen for Glitch Acquisition mode as in figure 3 41 Follow steps a through d if unfamiliar with menus a Select Trace screen b Assign Glitch Acquisition mode c Set Find Pattern to all DON T CARE x s and present for gt 30 00 ns d Set Then find Glitch on channels Acquisition mode Glitch Find Pattern XXXX present for Then find or Glitch Figure 3 41 Trace Screen 5 Adjust the power supply output for 150 3 33 HP 16510A Performance Tests
48. de happens when input data matches a user defined timing pattern or range When the acquisition chips are in agreement that their patterns match the analyzer begins to trigger asynchronously at an internal clock rate specified by the user and data storage begins HP 165104 Service 6 5 SELF TESTS Self tests for the HP 16510A State Timing Analyzer Module will identify the improper operation of major functional areas in the module They are not intended for component level diagnostics If there are multiple state timing modules they must be selected for testing at the main Test System menu All self tests can be run without access to the interior of the instrument If a failure is found the troubleshooting chart in paragraph 6 6 will instruct you to change the module or cable CAUTION The effects of ELECTROSTATIC DISCHARGE can damage electronic com ponents Grounded wriststraps and mats should be used when you perform any kind of service to this instrument or the cards in it SELF TEST ACCESS PROCEDURE a Disconnect all inputs and turn power switch on b From the startup screen shown in figure 6 2 touch Configuration field then touch Test Controller RS 232C Printer Figure 6 2 Startup Screen 6 3 HP 16510A Service Touch box to load Test System See figure 6 3 Touch box to Load Test System Card ID codes SLOT A SLOT B SLOT SLOT D SLOT E none none none none
49. e Timing C MACHINE 1 Waiting for Trigger Accumulate off s Div Delay Markers 100 ns 0 5 Off Sample period 20 000 ns Figure 3 51 Waveform Screen 3 40 10 11 12 13 HP 165104 Performance Tests Disconnect channels under test and connect remaining eight channels of pod being tested Repeat steps 3 5 and 6 through 9 Disconnect pod of data channels under test from probe tip assembly and connect next pod of data channels to be tested Return to Configuration screen and repeat steps 2 through 12 until all pods are tested 3 41 HP 16510A Performance Tests Table 3 1 Performance Test Record Hewlett Packard Tested by Model 16510A State Timing Card Work Order No Board Date Tested Number Recommended Calibration Interval 24 Months TEST RESULTS PARAGRAPH CLOCK QUALIFIER AND DATA Passed Failed INPUTS TEST 1 CLOCK QUALIFIER AND DATA INPUTS TEST 2 CLOCK QUALIFIER AND DATA INPUTS TEST 3 CLOCK QUALIFIER AND DATA INPUTS TEST 4 CLOCK QUALIFIER AND DATA INPUTS TEST 5 M M MM aea H A e M Ma a CLOCK QUALIFIER AND DATA INPUTS TEST 6 3 42 HP 16510A Performance Tests Table 3 1 Performance Test Record cont PARAGRAPH RESULTS CLOCK QUALIFIER AND DATA INPUTS TEST 7 GLITCH TEST THRESHOLD ACCURACY TEST DYNAMIC RANGE TEST 3 43 TABLE CONTENTS AD
50. e module refer to steps d through i of paragraph 2 8 MODULE INSTALLATION 4 1 INTRODUCTION This section provides information when to calibrate the module and how to calibrate ad just and warm up the module Also included in this section are equipment setups a list of recommended test equipment and a procedure for installation of the extender board 4 2 CALIBRATION INTERVAL To maintain proper operation of the HP 16510A State Timing Module calibration should be performed at approximately two year intervals when the instrument is being used under normal operating conditions If the instrument is used more than one shift per day it may have to be calibrated more often New modules are preadjusted at the factory to meet the specifications listed in Section 1 of this manual Before any adjustments are made to the module the performance tests in Section 111 should be done If the performance tests are within specifications then adjust ments are not necessary If adjustments are necessary refer to the safety summary at the front of this manual HP 16510A Adjustments SECTION IV ADJUSTMENTS 4 3 SAFETY REQUIREMENTS Specific warnings cautions and instructions are placed wherever applicable throughout the manual These must be observed during all phases of operation service and repair of the module Failure to comply with them violates safety standards of design manufacture and intended use of this m
51. er and Data Input Tests 1 3 2 Clock Qualifier and Data Input Tests 2 3 6 Clock Qualifier and Data Input Tests 3 9 Clock Qualifier and Data Input Tests 4 3 12 Clock Qualifier and Data Input Tests 5 3 16 Clock Qualifier and Data Input Tests 6 3 19 Clock Qualifier and Data Input Tests 7 mca pL M OS CIA 3 22 eciam 3 25 Threshold Accuracy ba TR pan e EBERT RR dash weet 3 30 gt Dynamic RANGE nes um oe Seda 3 37 3 1 INTRODUCTION The procedures this section test the HP 16510A State Timing Analyser s electrical per formance using the specifications listed in Section as the performance standards All tests can be performed without access to the interior of the instrument At the end of this section is a form that can be used as a record of performance test results 3 2 RECOMMENDED TEST EQUIPMENT Equipment recommended for performance tests is listed in table 1 3 Any equipment that satisfies the critical specifications given in the table may be substituted for the recommended models 3 3 TEST RECORD Results of
52. est verifies minimum swing voltages of the input probes and the maxi mum clock rate of the HP 16510A when it is in single phase mode Specification Minimum swing 600 mV peak lo peak Clock repetition rate Single phase is 25 MHz maximum Clock pulse width 310 ns at threshold Equipment Prise Generator HP 8161A 020 Oscilloscope ae ta 54201A 50 Ohm Feedthr 2 seva suas vd aste Ue EX C SD VES HP 10100C Test Connectors 2 see figure 3 1 Procedure 1 Connect the HP 16510A and test equipment as in figure 3 21 HP 16500A OSCILLOSCOPE PULSE GENERATOR LOGIC ANALYZER GND Facure CLK BIT DATA BITS FIGURE oomoo 16510 7805 19 67 3 21 Setup for Clock Qualifier and Data Inputs Test 5 Note In this setup eight channels are connected to test half of the pod at a time Ground lead must be grounded to ensure accurate test results 3 16 HP 16510A Performance Tests 2 Adjust pulse generator for the output in figure 3 22 Use double pulse mode of the pulse generator for the clock pulse I 86ns _ gt 1 9 1 6V DATA 1 3 It 4600s 1 9 1 6V CLK 1 3V 16519 WF 04 8 87 Figure 3 22 Wavef
53. eviations are used one in all capital let ters the other partially or not capitalized This was done because the abbreviations in the parts list are always all capitals However in other parts of the manual other abbreviation forms are used with both lower and uppercase letters 5 3 REPLACEABLE PARTS LIST Table 5 2 lists replaceable parts and is or ganized as follows a Electrical assemblies in alphanumeri cal order by reference designation b Chassis mounted parts in al phanumerical order by reference designation c Electrical assemblies and their com ponents in alphanumerical order by reference designation The information given for each part consists of the following a Complete reference designation b Hewlett Packard part number c Total quantity Qty of instrument HP 16510A Replaceable Parts SECTION V REPLACEABLE PARTS d Description of part e Check digit The total quantity for each part is only given once at the first appearance of the part num ber in the list 5 4 ORDERING INFORMATION To order a part listed in the replaceable parts table quote the Hewlett Packard part number check digit indicate the quantity required and address the order to the nearest Hewlett Packard office To order a part that is not listed in the replace able parts table include the instrument model number instrument serial number the descrip tion and function of the part and numbe
54. familiar with menus a Select Configuration screen b Set analyzer Type to Timing Assign pod under test to Analyzer 1 State Timing Configuration Analyzer 1 Name MACHINE 1 Timing Analyzer 2 Unassigned Pods Figure 3 34 Configuration Screen 3 26 HP 165104 Performance Tests 4 Setup the Format screen to assign all bits of pod under test to a label as in figure 3 35 Follow steps a and b if unfamiliar with menus a Touch label for pod under test b Assign all channels in pod under test lo label State Timing C Figure 3 35 Format Screen 3 27 HP 16510A Performance Tests 5 Set up the Trace screen as in figure 3 36 Follow steps a through c if unfamiliar with menus a Set Acquisition Mode lo Glitch b Set Find Pattern to all DON T CARE X s and present for gt 30 00 ns Set Then find Glitch on all channels Acquisition mode Glitch Lebel gt Base gt Find Then find Edge Figure 3 36 Trace Screen 3 28 HP 16510A Performance Tests Touch Run then drag finger to Single The analyzer will acquire dala and show glitches on channels under test as in figure 3 37 6 20 000 ns Waveform 1 State Timing C Sample period Accumulate Off Delay Markers s Div 0 5 Off 100 ns dod dod gg od rH 492904010101
55. he pod under test to Analyzer 1 as figure 3 47 a Select Configuration screen b Assign pod under test to Analyzer 1 State Timing C Configuration Analyzer 1 Analyzer 2 Unassigned Pods Pod 4 Figure 3 47 Configuration Screen 3 Configure the Format screen for User defined pod threshold of 1 0 V for the pod under test and assign all the bits of the pod to a label as in figure 3 48 Figure 3 48 Format Screen 3 38 4 5 HP 16510A Performance Tests Select Trace screen and assign Glitch Acquisition mode Set Find Pattern to all DON T CARE X s and present for gt 30 00 ns Set Then find Glitch on all channels Acquisition mode Glitch Bose gt Find Pattern XXXX Then find Edge or Figure 3 49 Trace Screen Adjust the power supply output for 9 0 V Configure the Trace screen for Glitch Acquisition mode as in figure 3 49 Refer to steps a through c if unfamiliar with menus 3 39 HP 16510A Performance Tests 6 Touch Run Data displayed on Waveform screen will be all high for pod under test as in figure 3 50 Sample period 20 000 ns s Div Delay Markers 100 ns 0 s Off Figure 3 50 Waveform Screen 7 Adjust power supply for output of 9 0 V 8 Change Format screen for threshold of 1 0 V 9 Touch Run Data displayed on the Waveform screen will be all low for channels under test as in figure 3 51 Stat
56. ic analyzer It can be configured as two indepen dent state analyzers or one state and one timing analyzer Some of the main features are e Simultaneous state state or simul taneous state timing analysis e Time interval number of states pat tern search minimum maximum and average time interval statistics e Uses transitional timing to store data only when there is a transition 5 clock inputs 4 clock qualifiers storage qualification time and num ber of state tagging and prestore Small lightweight probing 1 5 ACCESSORIES SUPPLIED The following accessories are supplied with the HP 16510A State Timing module Quantity one unless shown otherwise e Operating manual set e Service manual e 16 Channel Lead Sets grey tip HP 01650 61608 Qty 5 e 16 Channel Probe Cable HP 16510 61602 Qty 2 16 Channel Probe Cable HP 16510 61603 Qty 3 e Grabbers Set of 20 HP 5959 0288 Qty 5 1 6 ACCESSORIES AVAILABLE Termination adapter HP 01650 63201 e Service Data Supplement 16510 90903 Module specifications are listed in Table 1 1 These specifications are the performance standards against which the module is tested 1 8 OPERATING CHARACTERISTICS Table 1 2 is a listing of the module operating characteristics The operating characteristics are not specifications but are typical operating characteristics included as additional informa tion for the user 1 9 RECOMMENDED TE
57. imary Is matched to the available line voltage the correct fuse is installed and Safety Precautions are taken see the following warnings In addition note the instrument s external markings which are described under Safety Symbols WARNING oServicing instructions are for use by service trained personnel avoid dangerous electric shock do not perform any servicing unless qualified to do so oBEFORE SWITCHING ON THE INSTRUMENT the protective earth terminal of the instrument must be connected to the protective conductor of the mains powercord The mains plug shall only be inserted in a socket outlet provided with a protective earth contact The protective action must not be negaled by the use of an extension cord power cable without protective conductor grounding Grounding one conductor of a two conductor outlet is not sufficient protection olf this instrument is to energized via an auto transformer for voltage reduction make sure the common terminal is connected to the earth terminal of the power source oAny interruption of the protective grounding conductor inside or outside the instrument or disconnecting the protective earth terminal will cause a potential shock hazard that could result in personal injury o Whenever it is likely that the protection has been impaired the instrument must be made inoperative and be secured against any unintended operation oOnly fuses with the required rated cu
58. ime average X to 0 time and ratio of valid runs to total runs RUN STOP FUNCTIONS Run Starts acquisition of data in specified trace mode Stop In single trace mode or the first run of a repetitive acquisition STOP halts acquisition and displays the current acquisition data For sub sequent runs in repetitive mode STOP halts acquisition of data and does not change current display DATA DISPLAY ENTRY Display Modes State listing timing waveforms interleaved time correlated listing of two state analyzers time tagging on time correlated state listing and timing waveform display state listing in upper half timing waveform in lower half and time tagging on Timing Waveform Pattern readout of timing waveforms at X or marker Bases Binary Octal Decimal Hexadecimal ASCII display only and User defined symbols HP 165104 General Information Table 1 2 HP 16510A Operating Characteristics cont AUXILIARY POWER Power Through Cables 2 3 amp 5V per cable 2 amp SV per HP 16510A Current Draw Per Card amp 5V per HP 16510A OPERATING ENVIRONMENT Temperature Instrument O to 55 C 432 to 131 F Probe lead sets cables O to 65 C 32 to 149 F Humidity Instrument up to 95 relative humidity at 40 C 104 F Altitude To 4600 m 15 000 ft Vibration Operation Random vibration 5 500 Hz 10 minutes per axis 0 3 g rms Non operating
59. l plastic HORIZ horizontal P O part of HP Hewlett Packard printed circuit HP IB Hewlett Packard PCB printed circuit board Interface Bus PD power dissipation HR hour s PF picofards HV zhigh voltage Pl plug in HZ zHertz PL zplate d zinput output PLA zprogrammable logic zintegrated circuit array ID zinside diameter PLST plastic IN zinch PNP positive negative INCL 5 positive INCA ND incandescent POLYE polyester INP zinput Pos spositive position INTEN intensity POT potentiometer INTL internal POZI pozidrive INV zinverter peak to peak JFET field PPM parts per million effect transistor PRCN precision JKT jacket PREAMP preamplifier K zkilo 103 PRGMBL programmable L zlow PRL parallel LB pound PROG programmable LCH latch PSTN position LCL local PT point LED light emitting PW potted wirewound diode PWR power LG along R S reset set lithiuin RAM random access memory LK slock RECT rectifier LKWR lockwasher RET retainer Ls low power Schottky RF radio frequency LV slow voltage RGLTR regulator M mega 10 megohms RGTR register meter distance RK rack MACH RMS root mean square MAX U integrated circuit microcircuit v electron tube glow lamp VR voltage regulator breakdown diode w cable X Socket Y crystal unit piezo electric or quartz RND round ROM read only memory RPG rotary pulse
60. l degrade Test results may not be accurate if more than eight chan nels are connected to the test connector The Hewlett Packard part number for the BNC connector in figure 3 1 is 1250 1032 An equivalent part may be used in place of the Hewlett Packard part ND 16510 97 19 87 Figure 3 1 Test Connector 3 1 HP 165104 Performance Tests 3 7 CLOCK QUALIFIER AND DATA INPUTS TESTS 3 8 Clock Qualifier and Data Inputs Test 1 Description This test verifies maximum clock rate with counting mode and the setup and hold times for the falling edge of all clocks to pods 1 3 and 5 Specification Clock repetition rate With time or state counting mode on minimum time between states is 60 ns Hold time Data must be present after falling edge of all clocks O ns Setup time Data must be present prior to clock transition 10ns Equipment Pulse Qeneralof ce EC UN PS o CAT bw es NETT SE CR HP 8161A 020 OSCINOSCODE erc HP 54201A Power Splitter ec PP HP 11549A 50 Ohm Feedthru 8 10100 Test Connectors 2 see figure 3 1 Procedure 1 Connect the HP 16510A and test equipment as in figure 3 2 HP 165004 PULSE GENERATOR OSCILLOSCOPE 16510 1583 19 87 Figure 3 2 Setup for Clock Qualifier and Data Inputs Test 1 Note In this setup eight channels are connected
61. ll as pertinent Service Notes HP 165104 General Information SECTION I GENERAL INFORMATION To complete the service documentation for your system place this service manual in the 3 ring binder with your Logic Analysis System Service Manual 1 2 MODULES COVERED BY THIS MANUAL The information covered in this manual is for the HP 16510A State Timing Module If the card has changed a new card number will be assigned and the manual will be accompanied by a Manual Changes Supplement This sup plement explains the changes and how to adapt the manual to the newer card In addition to the change information the sup plement may contain information for correct ing errors in the manual To keep this manual as current and accurate as possible Hewlett Packard recommends that you periodically request the latest Manual Changes Supplement 1 3 SAFETY REQUIREMENTS Specific warnings cautions and instructions are placed wherever applicable throughout the manual These must be observed during all phases of operation service and repair of the module Failure to comply with them violates safety standards of design manufacture and intended use of this module Hewlett Packard assumes no liability for the failure of the cus tomer to comply with these safety requirements ti HP 16510A General Information 1 4 PRODUCT DESCRIPTION The HP 16510A State Timing Module is an 80 channel 25 MHz state 100 MHz timing log
62. n are available through your local Hewlett Packard offices A D ADJ AL AMPL ANLG ANSI ASSY ASTIG xfan motor battery sdiode diode thyristor varactor delay line zannunciator lamp LED misc electrical part samperes analog to digital alternating current sadjust ment saluminum samplifier sanalog American National Standards Institute massembly astigmatism ASYNCHRO easynchronous ATTEN AWG BAL BCD BD BFR BIN BRDG BSHG BW CAL ccw CER CFM CH CHAM CHAN CHAR cM CMOS CMR CNDCT CNTA CON CONT CRT cw D D A DAC DARL DAT OBL DBM DC DCDR DEG DEMUX DET DIA DIP DIV DMA DPDT DRC DRVR sattenuator American wire gauge balance decimal board buffer sbinary bridge bushing bandwidth ceramic cermet resistor calibrate calibration carbon composition counterclockwise ceramic cubic feet minute choke chamfered achannel zcharacter centimeter complementary metal oxide semiconductor common mode rejection sconductor counter connector contact cathode ray tube clockwise diameter digital to analog digital to analog converter darlington zdata double decibel referenced to imW direct current decoder degree demultiplexer detector diameter dual in line package zdivision direct memory acces
63. n inspection it The Hewlett Packard office will arrange for repair or replacement at Hewlett Packard s option without waiting for claim settlement 2 3 PREPARATION FOR USE WARNING Read the Safety Considerations in the front of this manual and in Section 1 before installing or operating this module HP 16510A Installation SECTION II INSTALLATION 2 4 POWER REQUIREMENTS All power supplies required for operating the HP 16510A State Timing Module are supplied to the module through the backplane connector 2 5 SAFETY REQUIREMENTS Specific warnings cautions and instructions are placed wherever applicable throughout the manual These must be observed during all phases of operation service and repair of the module Failure to comply with them violates safety standards of design manufacture and intended use of this module Hewlett Packard assumes no liability for the failure of the cus tomer to comply with these safety requirements 2 6 PROBE CABLE INSTALLATION The HP 16510A State Timing Module comes with probe cables installed by the factory If a cable is to be switched or replaced refer to PROBE CABLE REPLACEMENT in Section VI of this manual 2 7 INSTALLATION CAUTION Do not install remove or replace the module in the instrument unless the in strument power is turned off The HP 16510A State Timing Module will take up one slot in the card cage For every addi tional HP 16510A State Timing M
64. nd CPU interface for the specified state timing ac quisition chip 6 6 TROUBLESHOOTING If self tests indicate a failure begin at the Start of the troubleshooting flow chart shown in figure 6 9 When a specific test fails you will be instructed to replace a faulty module or you will be refer red to other flow charts for the isolation of the faulty module or cable 6 7 HP 16510A Service Troubleshooting Sheet 1 START TIMIMG CARD PRESENT AT THE APRROPRINIE CARDSLOT THE CONFIGURATION MENU NO GO TO TROUBLESHOOTING SHEET 3 FROM TROUBLESHOOTING YES SHEET 3 5 CAN YOU VERIFY THE USER NO GO TO ee PROBLEM 2 5 60 TEST SYSTEM SCREEN RUN MAINFRAME TEST DOES THE MAINFRAME TEST RUN OK e I o e 2 S I aq ul l m 2 Q a f NO GO TO MAINFRAME TROUBLESHOOT ING 7 c GO TO TROUBLESHOOTING SHEET 2 16515 T81 Figure 6 9 Troubleshooting Flow Chart 6 8 HP 165104 Service Troubleshooting Sheet 2 FROM TROUBLESHOOTING SHEET 1 4 6 GO TO TEST SYSTEM SCREEN NOTE 1 SELF TESTS MAY BE RUN INDIVIDUALLY OR RUN RUN ALL ANALYZER TESTS STATE TIMING SELF TESTS SEE NOTE 1 DO ALL SELF TESTS PASS GO TO TROUBLEHSOOTING SHEET 5 EXIT TEST SYSTEM THE USER PROBLEM STILL PRESENT GO TO TROUBLEHSOOTING SHEET 6 16515 T82 Figure 6 9 Troubleshoo
65. ne connector Keep applying pressure to the center of card endplate while tightening thumb screws finger tight h Repeat for cards and filler panels a bottom to top order See figure 2 3 E 2 NEXT HIGHEST BOTTOM CARD 16530 tx15 Figure 2 3 Endplate Overlap i Any filler panels that are not used should be kept for future use Filler panels must be in stalled in all unused card slots for correct air circulation HP 16510A Installation 2 9 OPERATING ENVIRONMENT The operating environment is listed in table 1 2 of Section of this manual Note should be made of the non condensing humidity limita tion Condensation within the instrument can cause poor operation or malfunction Protection should be provided against internal condensation The HP 16510A State Timing Card will operate at all specifications within the temperature and humidity range given in table 1 2 However reliability is enhanced when operating the module within the following ranges Temperature 20 to 35 C 68 to 95 Humidity 20 to 80 non condensing 2 10 STORAGE The module may be stored or shipped in en vironments within the following limits Temperature 40 C to 75 C Humidity Up to 90 at 65 C Altitude Up to 15 300 meters 50 000 feet The module should also be protected from temperature extremes which cause condensa tion on the module 2 4 2 11 PACKAGING The following general instructions should
66. nels per label Primary use is for naming groups of channels such as address data and control busses INDICATORS Activity Indicators Provided in the Configuration State Format and Timing Format menus for identifying high low or changing states on the inputs Markers Two markers X and are shown as dashed lines on the display Trigger Displayed as a vertical dashed line in the timing waveform display and as line 0 in the state listing display MARKER FUNCTIONS Time Interval The X and O markers measure the time interval between one point on a timing waveform and trigger two points on the same timing waveform two points on different waveforms or two states time tagging on 1 9 HP 165104 General Information Table 1 2 HP 16510A Operating Characteristics cont Delta States State Analyzer Only The X and 0 markers measure the number of tagged states between one state and trigger or between two states Patterns The X and 0 markers can be used to locate the nth occurrence of a specified pattern before or after trigger or afler the beginning of data The O marker can also find the nlh occurrence of a pattern before or after the X marker Statistics X to marker statistics are calculated for repelilive acquisitions Patterns must be specified for bolh markers and statistics are kept only when both patterns can be found in an acquisition Statistics are minimum X to 0 time maximum X to 0 t
67. odule Hewlett Packard assumes no liability for the failure of the cus tomer to comply with these safety requirements 4 4 RECOMMENDED TEST EQUIPMENT Recommended adjustment test equipment is listed in table 1 3 Any equipment that satisfies the critical specifications given in the table may be substituted for the recommended models 4 5 EXTENDER BOARD INSTALLATION Before any adjustments or calibration checks are done the HP 16510A Card must be instal led on an extender board The procedure for this installation is on the next page 4 1 TABLE OF CONTENTS REPLACEABLE PARTS 5 1 5 2 5 3 5 4 5 5 5 6 IDITOCIHCHOTISS 2er es tars era cele ein a Muri sare ond 5 1 Abbreviations ad rem rer 5 1 Replaceable cena 5 1 Ordering Informatloni 5 1 6 6 5 6622 5 2 2 225222 5 e niTer REA 5 1 Direct Mail order System 5 1 INTRODUCTION This section contains parts and ordering in formation for the HP 16510A State Timing Module Table 5 1 lists the reference designa tions and abbreviations used throughout this manual Table 5 2 lists all replaceable parts by reference designator 5 2 ABBREVIATIONS Table 5 1 lists abbreviations used throughout the manual In some cases two forms of the abbr
68. odule you in stall you will need an additional slot They may be installed in any slot and in any order The installation procedure for the module is shown step by step in paragraph 2 8 2 1 HP 165404 Installation 2 8 MODULE INSTALLATION CAUTION The effects of ELECTROSTATIC DISCHARGE can damage electronic components Use grounded wriststraps and mats when you are per forming any kind of service to this module INSTALLATION CONSIDERATIONS The HP 16510A State Timing Module s can be installed in any available card slot and any order e Cards or filler panels below the empty slots intended for module installation do not have to be removed The probe cables do not have to be removed to install the module PROCEDURE a Turn instrument power switch off unplug power cord and disconnect any input connections b Starting from the top loosen thumb screws on filler panel s and card s Starting from the top begin pulling card s and filler panel s out half way See figure 2 1 TOP CARD ci NEXT LOWEST 2 18530 tX13 Figure 2 1 Endplate Overlap 2 2 HP 165104 Installation d Lay the cable s flat and pointing out to the rear of the card See figure 2 2 e Slide the analyzer card approximately half way into the card cage f If you have more analyzer cards to install repeat step d and e 16810 Figure 2 2 Cable Position g Firmly seat bottom card into backpla
69. orms for Clock Qualifier and Data Input Test 5 3 Assign pod under test to Analyzer 1 as in previous test figure 3 4 4 Assign appropriate clock rising clock edge and channels under test to label in Format screen as in previous test figure 3 5 5 Setup the Trace screen without sequencing levels and Count Off as in previous test figure 3 10 6 Touch Run The Listing screen will be displayed showing alternating F s and O s for the channels under test as in figure 3 23 State Timing Listing 1 narkers Off Label BIT 1 2 00 3 FF 4 00 5 FF 6 00 7 FF 00 9 10 00 1 12 00 13 14 00 15 16 00 Figure 3 23 Listing Screen 3 17 HP 16510A Performance Tests 7 Disconnect the channels under test from the test connector and connect the remaining channels 8 Repeat step 6 9 Disconnect lhe pod of data channels under test from the probe tip assembly and connect the next pod of data channels to be tested 10 Return to Configuration screen and repeat sleps 3 through 9 until all pods have been tested with each clock 3 18 HP 16510A Performance Tests 3 13 Clock Qualifier and Data Inputs Test 6 Description This performance test verifies the maximum clock rate for mixed mode clocking during state operation Specification Clock repetition rale Single phase is 25 MHz maximum With time or state counting minimum time between states is 60 ns Both mixe
70. r of parts required Address the order to the nearest Hewlett Packard office 5 5 EXCHANGE ASSEMBLIES Exchange assemblies are available when a repairable assembly is returned to Hewlett Packard These assemblies have been set up on the Blue stripe Exchange program This allows the customer to exchange the faul ty assembly with one that has been repaired calibrated and performance verified by the factory The cost is significantly less than that of a new assembly Exchange assemblies are listed in a separate section in the replaceable parts table They have a part number in the form XXXXX 695XX where the new parts would be XXXXX 665XX Before ordering a blue stripe assembly check with your local parts or repair organization for procedures i 5 1 HP 165104 Replaceable Parts 5 6 DIRECT MAIL ORDER SYSTEM Within the USA Hewlett Packard can supply parts through direct mail order The advant ages are as follows a Direct ordering and shipment from Hewlett Packard Parts Center in Mountain View California b No maximum or minimum on any mail order there is a minimum order for parts ordered through local Hewlett Packard offices when orders require billing and invoicing 5 2 c Prepaid transportation there is a small handling charge for each order d No invoices to provide these ad vantages check or money order must accompany each order Mail order forms and specific ordering informa tio
71. r of card See figure 6 14 Figure 6 14 Card On Antistatic Mat f Using a No 10 torx 6 driver remove four screws that hold cable retainer onto card See figure 6 15 16510 EX03 RETAINER SCREWS 4 UPPER BOARD MOUNTING SCREWS 2 LOWER CABLE RETAINER CABLE Figure 6 15 Retainer And Screws 6 18 HP 165104 Service g Remove cable s from card connector s and install new cable s See figure 6 16 CABLES 16510 EX02 Figure 6 16 Card Connectors h Install cable retainer i At this point go to step g of paragraph 6 7 MODULE REPLACEMENT and continue in stallation of cards HEWLETT PACKARD 16510 90901 PRINTED IN U S A
72. race screen without sequencing levels and set Count to States as shown in figure 3 19 Refer to a and b if unfamiliar with the menus a Touch Count and set to Anystate b Touch Prestore and set to Off Sequence Levels While storing no state TRIGGER on ea 1 times Store anystate Count States o Lebel gt Base Figure 3 19 Trace Screen HP 16510 Performance Tests 6 Touch Run The Listing screen will be displayed and will show F s for the channels under test See figure 3 20 State Timing C Listing 1 Markers off Y Base Relative 0 T FF FF Figure 3 20 Listing Screen Note To ensure consistent pattern of F s in listing use Roll field and knob to scroll through State Listing 7 Disconnect the channels under test from the test connector and connect the remaining eight channels to be tested 8 Assign the remaining eight channels to the label and repeat step 6 9 Disconnect the pod of channels under test from the probe tip assembly and connect the next pod pods 2 and 4 of data channels to be tested 10 Return to the Configuration screen and repeat steps 3 through 9 until all the pods have been tested 11 After pods 2 4 been tested repeat steps 3 through 10 assigning the next clock J K L M and N 3 15 HP 16510A Performance Tests 3 12 Clock Qualifier and Data Inputs Test 5 Description This performance t
73. rrent voltage and specified type normal blow time delay etc should be used not use repaired fuses or short circuited fuseholders To do so could cause a shock or fire hazard o Do not operate the instrument the presence of flammable gasses or fumes Operation of any electrical instrument in such an environment constitutes a definite safety hazard o Do not Install substitute parts or perform any unauthorized modification to the instrument o Adjustments described in the manual are performed with power supplied to the instrument while protective covers are removed Energy available at many points may If contacted result in personal injury oAny adjustment maintenance and repair of the opened instrument under voltage should be avoided as much as possible and when inevitable should be carried out only by a skilled person who is aware of the hazard involved o Capacitors inside the instrument may still be charged even If the instrument has been disconnected from its source of supply SAFETY SYMBOLS Instruction manual symbol The product will be marked with this symbol when It 15 necessary for the user to refer to the instruction manual in order to protect against damage to the product Indicates hazardous voltages 4 Earth terminal sometimes used in manual to indicate circuit common connected to grounded chassis The WARNING sign denotes a hazard It WARNING calls attention to a procedure
74. s double pole double throw zDAC refresh controller zdriver Table 5 1 Reference Designators and Abbrevia REFERENCE DESIGNATORS HP 16510A Replaceable Parts tions F fuse Q stransistor SCR FL filter triode thyristor H shardware R resistor J selectrical connector RT sthermistor stationary portion jack S switch jumper L coil inductor T transformer MP misc mechanical part TB terminal board P selectrical connector TP test point moveable portion plug ABBREVIATIONS dowel MFR manufacturer ECL coupled logic MICPROG microprocessor ELAS elastomeric MINTR miniature EXT xexternai MISC miscellaneous F zfarads netal film MLD molded resistor MM millimeter FC carbon film MO oxide composition MTG mounting FD feed MTLC metallic FEM MUX multiplexer FF flip flop MW milliwatt FL flat N nano 10 9 FM foam from NC no connection FR front NMOS n channel metal FT gain bandwidth oxide semiconductor product NPN negative positive FW full wave negative fixed NPRN neoprene GEN NRFR not recommended for GND ground ed field replacement GP general purpose NSR separately GRAT graticule replaceable GRV groove NUM numeric H shenries high OBD order by description HD xhardware OCTL octal HDND hardened outside diameter HG mercury OP operational amplifier HGT sheight osc oscillator HLCL helica
75. tate Count States Prestore Off BI xil x 3 6 5 6 10 11 HP 16510A Performance Tests Touch Run The Listing screen will be displayed and will show 5 for the channels under test See figure 3 7 State Timing C Listing 1 Markers ort 0 FF Figure 3 7 Listing Screen Note To ensure consistent pattern of F s in listing use Roll field and knob to scroll through State Listing Disconnect the channels under test from the test connector and connect the remaining channels on this pod Assign the remaining eight channels to the label then repeat step 6 Disconnect the pod of channels under test from the probe tip assembly and connect the next pod pods 1 3 or 5 of data channels to be tested Return to the Configuration screen and repeat steps 3 through 9 until all the pods have been tested After pods 1 3 and 5 have been tested repeat steps 3 through 10 assigning the next clock clocks J K L M or N 3 5 HP 16510A Performance Tests 3 9 Clock Qualifier and Data Inputs Test 2 Description This performance test verifies the setup and hold time specification for the rising edge transition of all clocks Specification Setup Time Data must be present prior to clock transition gt 10 ns Hold Time Data must be present after rising clock transition ns Equipment Pulse Generator cues pec Diod M Ix
76. this module INSTALLATION CONSIDERATIONS The HP 16510A State Timing Module s can be installed in any available card slot and in any order Cards or filler panels below the slot intended for module installation do not have to be removed The probe cables not have to be removed to install the module PROCEDURE a Turn instrument power switch off unplug power cord and disconnect any input or out put connections b Starting from the top loosen thumb screws on filler panel s and card s c Starting from the top begin pulling card s and filler panel s out half way See figure 6 10 CAUTION All multi card modules will be cabled together Care should be taken to pull these cards out together TOP CARD NEXT LOWEST 16830 13 Figure 6 10 Endplate Overlap HP 16510A Service Pull the faulty state timing module completely out e Push all other cards into card cage but not completely in This is to get them out of the way for state timing module installation f Replace faulty card or cable in module if faulty cable see paragraph 6 8 CABLE REPLACEMENT d g reinstall module lay cable flat and pointing out to the rear of card See figure 6 11 16510 01 Figure 6 11 Cable Position h Slide card approximately half way into mainframe card slot i If there are more modules to install repeat steps h and i until all modules are in place
77. ting Flow Chart cont 6 9 A c m e 5 2 e o T m m m HP 16510A Service Troubleshooting Sheet 3 FROM TROUBLESHOOTING SHEET 1 TO TEST SYSTEM SCREEN RUN MAINFRAME TEST 7 INTERMODULE TEST NOTE 2 STATE TIMING 10 31 15 VALID STATE TIMING ID PRESENT AT THE APPROPRIATE CARDSLOT SEE NOTE 2 YES PROBABLE SOFTWARE PROBLEM NO TURN OFF POWER AND RESEAT CARDS RERUN MAINFRAME TEST 7 p T o e E T Ww au 2 04 H IS VALID PRESENT AT THE YES APPROPRIATE CARDSLOT EXIT TEST SYSTEM SEE NOTE 2 1651585 183 NO GO TO TROUBLESHOOTING GO TO TROUBLESHOOTING SHEET 1 SHEET 4 Figure 6 9 Troubleshooting Flow Chart cont 6 10 HP 165104 Service Troubleshooting Sheet 4 FROM TROUBLESHOOTING SHEET 3 TURN OFF POWER PUT SUSPECT STATE TIMING CARD IN ANOTHER CARDSLOT 15 VALID STATE TIMING REPLACE ID PRESENT AT THE THE MOTHERBOARD APPROPRIATE CARDSLOT REPLACE THE STATE TIMING CARD GO TO TROUBLESHOOTING SHEET 2 Figure 6 9 Troubleshooting Flow Chart cont 2 Q c w m e 8 e e I m m A HP 165104 Service Troubleshooting Sheet 5 FROM TROUBLESHOOTING SHEET 1 GO TO TEST SYSTEM SCREEN RUN STATE TIMING SELF TESTS SEE NOTE 3 NOTE 3 SELF TESTS MA
78. to Single or Repetitive i During the time a Single run or a Repetitive run is executing the Run field will change to Stop HP 165404 Service To stop Repetitive run touch Stop See figure 6 7 exit the test touch Done State Timing Chip 1 Tests runs failures communication analyzer IC threshold This test checks the threshold memory and CPU interfece for the specified state timing acquisition chip Figure 6 7 Stop Field k exit the self tests touch the following fields in the numbered sequence below State Timing 2 Test System 3 Configuration 4 Exit Test I Touch the box to Exit Test System See figure 6 8 Test System Exit Test box to Exit Test System Cerd ID codes SLOT A SLOT B SLOT C SLOT D SLOT E none none none none 051 Figure 6 8 Exit Test System HP 16510A Service TEST DESCRIPTIONS Chip 1 Tests This test checks the threshold memory and CPU interface for the specified state timing ac quisition chip Chip 2 Tests This test checks the threshold memory and CPU interface for the specified state timing ac quisition chip Chip 3 Tests This test checks the threshold memory and CPU interface for the specified state timing ac quisition chip Chip 4 Tests This test checks the threshold memory and CPU interface for the specified state timing ac quisition chip Chip 5 Tests This test checks the threshold memory a
79. to test eight channels at a time Ground lead rnust be grounded to ensure accurate test results 3 2 HP 165104 Performance Tests Adjust pulse generator for the output in figure 3 3 6 69 3 21 9 10ns 1 6 DATA AND CLK 1 3V 1651 O 0F 67 8 87 Figure 3 3 Waveform for Clock Qualifier and Data Inputs Test 1 Assign the pod under test to Analyzer 1 in the Configuration screen as in figure 3 4 Refer to steps a and b if unfamiliar with menus a Touch Type field of Analyzer 1 and set to State b Assign the pod to be tested to Analyzer 1 State Timing C Configuration Analyzer 1 Analyzer 2 Name MACHINE 1 Unassigned Pods Figure 3 4 Configuration Screen HP 165104 Performance Tests 4 Assign appropriate clock falling edge and 8 channels of the pod under test to a label in the Format screen as shown in figure 3 5 Refer to steps a and b if unfamiliar with the menus a Touch Clock field and set appropriate clock for a falling edge b Touch Labels and turn labels on State Timing Clock Ls Pod Ci TTL Figure 3 5 Format Screen 5 Set the Trace screen without sequencing levels and set Count to States as shown in figure 3 6 Refer to a and b if unfamiliar with the menus a Touch Count and set to Anystate b Touch Prestore and set to Off Sequence Levels While storing no state TRIGGER on a 1 times Branches Off 2 Store anys

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