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1. 1 External Reference Input 3 External Program RUN CONT Input 2 Internal Reference 4 1 0 Port Output P 3 o 5 Power J J o V NA NL NU NA ND o zs eo deb eem jo o E Jo e plo 5 5 zi uu 6 GPIB Interface 7mini DIN Keyboard Connector 10 Video Port 11 Printer Port Figure 2 3 Analyzer Rear Panel External Reference Input Connects an external frequency reference signal to the analyzer that is used to phase lock the analyzer for increased frequency accuracy When the analyzer is equipped with the external oven option 1D5 this connector must be connected to REF OVEN connector The external frequency reference function is automatically enabled when a signal is connected to this input When the signal is removed the analyzer automatically switches back to its internal frequency reference Front and Rear Panel Test Station and Test Heads 2 9 2 Internal Reference Output Connects to the frequency reference input of an external instrument to phase lock it to the analyzer 3 External Program RUN CONT Input 4 I O Port 5 Power 6 GPIB Interface Externally triggers RUN or CONT of the HP Instrument BASIC program The positive edge of a pulse more than 20 us wide in the Low state triggers RUN or coNT The signal is TTL compatible Connects to external devices such
2. RETURN Compensation Kit Menu Letter Menu Fixure Compensation Menu Impedance Fixture Permittivity Fixture COMP KIT TEFLON a USER KEE SAVE USER KIT MODIFY TEFLON Y DEFINE STANDARD Y COMPEN LOAD MENU y ET REAL SHORT En LOSS COMP POINT THICKNESS FIXED DONE STD DONE DEFINED COMPEN EXTENSION RESUME ABEL ON off COMP SEQ EXTENSION VALUE KIT DONE MODIFIED d RETURN Compensation Kit Menu Port Extension Menu Fixture Compensation Menu Permittivity Fixture Permeability Fixture CE005014 Figure 5 41 Softkey Menu Accessed from Cal key 5 54 Measurement Block Calibration Menu CALIBRATE MENU B OPEN SHORT LOAD LOW LOSS CAPACITOR CAL POINTS FIXED DONE RESUME CAL SEQUENCE CAL FIXTURE COMPEN gt _ Fixture Compensation Menu Eel N Cal Kit Menu COMP USER p O Compen Kit Menu PORT gt EXTENSION Port Extension Menu
3. LOAD HORT LOVWELOSS CGAL KIT fmm CAPACITOR CAL POINTS USER KIT FIXED SAVE OM ee BONE USER KIT CAL MODIFY Imm x DONE RESUME CAL DEFINE COMPEN SEQUENCE STANDARD Y FIXTURE OPEN RESUME COMPEN CONDUCTIG E SEQ CAPRICI CAL KIT SEEN 7 SHORT rr RESIST R onore INDUCT Ly USER o SHORT PORT RESIST R on OFF EXTENSION T REACT X LOAD STD DONE on OFF H i DEFINED Calibration Menu CBE y RETUR KEE nasus Fixture Compensation Menu Impedance Fixture LOAD RETURN COMPER RIT Calibration Kit Menu MODIFY IUSER Y DEFINE STANDARD Y OPEN CONDUCT G AO COMPEN SHORT MENU de RESIST4R INDUCTI OPEN LOAD SHORT RESIST R oo INDUCT COMP POINT STD DONE FIXED DEFINED DONE LABEL KIT COMPEN KIT DONE RESUME MODIEIED COMP SEQ RETURN
4. FIXTURE PERMITTVTY 16453 16453 MATERIAL b SIZE PERMEABLTY 16454 S Complex Permittivity E RETURN Measurement Menu Dielectric Material Fixture Menu 4 THICKNESS gt DONE anj Dielectric Material Size Menu CE005049 Figure 5 6 Softkey Menus Accessed from the Key for Permittivity Measurement when Smith Polar Admittance or Complex Plane Format is selected Measurement Block 5 7 IMPEDANCE amp ADMITTANCE 00 REFL COEF IMPEDANCE an 1 NONE PERMEABLTY PERMITTVTY n 16453 FIXTURE PERMEABLTY 16454 S 16454 5 MATERIAL SELECT SIZE FIXTURE Y FIXTURE Complex Permeability 164545 Measurement Menu 16454 L RETURN VL RETURN Magnetic Material Fixture Menu og INNER gt DIAMETER OUTER DIAMETER HEIGHT DONE MODIFIED Magnetic Material Size Menu CE005050 Figure 5 7 Softkey Menus Accessed from the Meas Key for Permeability Measurement when Smith Polar Admittance or Complex Plane Format is selected 5 8 Measurement Block Impedance
5. MORE ppl Para F Impedance Measurement Menu FIXTURE NONE SINGLE Impedance Fixture Menu PARAMETER FIXTURE NONE CE005008 Figure 5 10 Dual Parameter Menu m Z 9 Measures Z on channel 1 and measures on channel 2 R X Measures R on channel 1 and measures X on channel 2 m Y Measures Y on channel 1 and measures 0 on channel 2 G B Measures G on channel 1 and measures B on channel 2 3 Ls Q Measures L on channel 1 and measures Q on channel 2 Lp Q Measures L on channel 1 and measures Q on channel 2 s D Measures C on channel 1 and measures D on channel 2 J p D Measures C on channel 1 and measures D on channel 2 SINGLE PARAMETER Leads to the Impedance Measurement Menu FIXTURE Leads to the Fixture Menu which is used to select the test fixture used with the analyzer The selected test fixture is displayed in brackets in the softkey label 5 12 Measurement Block Note A ai Impedance Measurement Measurement Parameters Summary Complex Impedance Parameters m Impedance magnitude Z m Impedance phase 0 m Resistance R m Reactance X Complex Admittance Parameters m Admittance magnitude Y m Admittance phase 0y m Resistance G m Reactance B Reflection Coefficient m Reflection coefficient magnitude T m Reflection coeffici
6. Temparature Coefficient Measurement Program GPIB Cable Test Fixture Test Station Temperature Chamber High Temperature Test Head Figure C 1 Equipment Setup C 2 Option 013 014 Temperature Coefficient Measurement Temperature Coefficient Measurement Figure C 2 shows the test head and test stand setup Ce2ot0t O O Figure C 2 Test Head and Test Stand Setup High Temperature Test Head Fixture Stand Specimen Temperature Sensor Chamber Temperature Sensor Test Station Test Station Stand Pad Temperature Chamber Option 013 014 Temperature Coefficient Measurement C 3 Temperature Coefficient Measurement Quick Start Calibration When the temperature humidity becomes the reference values perform calibration at the high temperature test head APC 7 connector This calibration procedure is the same as the one for the impedance dielectric magnetic measurements The USER DEFINED calibration is required when the high temperature test head is connected The analyzer is set to the USER DEFINED calibration automatically Setting the Test Fixture The test fixture should be set on the test head after calibration The setup for the 16194A is shown in Figure C 3 Figure C 3 16194A Connection Select your test fixture model number using the hardkey Fixture
7. Test Station Test Head Figure 9 1 Analyzer Simplified Block Diagram Analyzer Features 9 1 Data Processing Data Processing Overview The analyzer s receiver converts the input signal into useful measurement information This conversion occurs in two main steps First the high frequency input signal is translated to fixed low frequency IF signals using analog mixing techniques Second the IF signals are converted into digital data by an analog to digital converter apc From this point on all further signal processing is performed mathematically by the analyzer microprocessor and digital signal processor The following paragraphs describe the sequence of math operations and the resulting data arrays as the information flows from the ADC to the display They provide a good foundation for understanding most of the measurement functions and the order in which they are performed Figure 9 2 is a data processing flow diagram that shows the flow of numerical data from the ADC to the display The data passes through several math operations shown as single line boxes Most of these operations can be selected and controlled by the front panel MEASUREMENT block menus The data is also stored in data arrays shown as double line boxes These arrays are places in the flow path where the data is accessible via GPIB or by using the floppy disk drive or the memory disk Figure 9 2 also shows other data arrays show
8. CE005027 Figure 5 42 Calibration Menu m CALIBRATE MENU Leads to the following softkeys which are used to perform a calibration measurement O OPEN Measures OPEN standard of the cal kit for the calibration SHORT Measures SHORT standard of the cal kit for the calibration c LOAD Measures LOAD standard of the cal kit for the calibration A LOW LOSS CAPACITOR Measures LOW LOSS CAPACITOR standard of the cal kit for the calibration CAL POINTS Toggles between FIXED and USER DEFINED to select the calibration measurement points When FIXED is displayed the analyzer performs calibration measurements on points fixed across the full frequency sweep range and the effective value for the points between these measured points will be calculated using the interpolation method When USER is displayed the analyzer performs calibration measurements on the same points as the current stimulus setting i For user defined calibration set point averaging factor to 32 Y Note 4 DONE CAL Completes the calibration and then computes and stores the error coefficients The notation COR calibration on fixed cal point is on or Cor calibration in user cal points is on is displayed on the left side of the screen m RESUME CAL SEQUENCE Eliminates the need to restart a calibration sequence that was interrupted to access some other menu Goes back to the point where the calibration sequence was interrupted
9. MORE ele DUAL PARAMETER PAGER MATERIAL SIZE DUAL PARAMETER FIXTURE 16454 MATERIAL SIZE DUAL PARAMETER FIXTURE 16454 MATERIAL Eb SIZE DUAL PARAMETER FIXTURE 16454 MATERIAL SIZE DUAL PARAMETER FIRTURR MATERIAE SIZE DUAL PARAMETER FIXTURE 16454 MATERIAE SIZE Permeability Measurement Menu y PEDANCE SN NONE PRMITTVTY NNER ur ut PERMITTVTY DIAMETER T6454 r OUTER PERMEABLTY HE tang 16454 S DIAMETER HEIGHT ens SELECT FIXTURE Y DONE SINGLE MODIFIED FIXTURE AMETER ps FIXTURE 16454 164540 Magnetic Material E MATERIAL RETURN SIZE Size Menu NL RETURN Dual Parameter Menu Magnetic Material Measurement Magnetic Material Fixture Menu CE005061 Figure 5 4 Softkey Menus Accessed from the Meas Key for Permeability Measurement ur tans Measurement
10. RETURN RETURN RETURN DEFAULT COLORS SAVE COLORS RECALL GGLORS RETURN Co005022 Figure 5 33 Adjust Display Menu m INTENSITY Sets the display intensity as a percentage of the brightest setting m BACKGROUND INTENSITY Sets the background intensity of the display as a percentage of the white level m MODIFY COLORS Displays the menu used for color modification of the display elements O CH1 DATA Selects channel 1 data trace for color modification and displays the Color Adjust menu O H1 MEM LIMIT LINE Selects channel 1 memory trace and limit lines for color modification and displays the Color Adjust menu O CH2 DATA Selects channel 2 data trace for color modification and displays the Color Adjust menu O CH2 MEM LIMIT LINE Selects channel 2 memory and the reference line and limit line for color modification and displays the Color Adjust menu C GRATICULE Selects the graticule and a portion of softkey text where there is a choice of a feature being ON or OFF for color modification and displays the Color Adjust menu 5 42 Measurement Block bigis O WARNING Selects the warning annotation for color modification and displays the Color Adjust menu MORE in this menu displays softkeys to select other elements for color modification c TEXT MARKER Selects all the non data text for color modification for example softkey labels and d
11. Y MAG a MAGI REFLCSEF eacacmnce e usin PRLice ERNS RESIST READS SEES REACTOS Ere ae INDECINCE D FACTOR wo a BIAGCY PRL Lp D RE RE MORE SERES SEROTOR 35 MORE 415 MORE Lp Q EM Es D DUAL RAMETER p Dj FIXTURE NONE MORE 2 2 SINGLE DUAL PARAMETER PARAMETER FITURE FIXTURE NONE NONE SINGLE PARAMETER DUAL FIXTURE RAMETER NONE FIXTURE NONE DUAL Dual Parameter Menu PARAMETER FXTURE Impedance Measurement NONE DUAL PARAMETER FIXTURE NONE Impedance Measurement Menu SELECT IMPEDANCE FIXTURE FIXTURE NONE SE FIXTURE NONE PERMITTIVITY ABIIT 16453 i 16191 PERMEABLTY 16192 18192 NO OPTION 16454 8 I I Te OPTIONOO2 002 SELECT Tis 16194 SAVE USER USER USER FXIR KIL RETURN MODIFY RETURN INONE Y AVE USER DEFINE EXTR KIT EXTENSION MODIFY LABEL NONE y FIXTURE DEFINE KIT DONE EXTENSION MODIFIED
12. CE008015 Figure 8 4 Instrument BASIC Menu Step Allows you to execute one program line at a time This is particularly useful for debugging Continue Resumes program execution from the point where it paused Run Starts a program from its beginning Pause Pauses program execution after the current program line is executed Stop Stops program execution after the current line To restart the program press Run Edit Enters into the EDIT mode In the EDIT mode the following softkeys are displayed on the softkey menu area System ASSIGN Hp4291 Produces the command ASSIGN Hp4291 TO 800 at the cursor s current position OUTPUT Hp4291 Produces the command OUTPUT 0Hp4291 at the cursor s current position ENTER Hp4291 Produces the command ENTER Hp4291 at the cursor s current position END Produces the command END GOTG LINE Allows you to move the cursor to any line number or to a label After pressing GOTO LINE type a line number or a label and then press Return The cursor moves to the specified line or label RECALL LINE Recalls the last deleted line END EDIT Exits the edit mode CAT Enters the CAT command in the BASIC command line The CAT command displays the list of files on a disk SAVE Enters the SAVE command in the BASIC command line The SAVE command saves a program as an ASCII file RE SAVE Enters the RE SAVE command in the BASIC command line The RE SAVE command
13. DUAL PARAMETER FIXTURE 16453 MATERIAL SIZE DUAL PARAMETER FIXTURE 16453 MATERIAL SIZE Permittivity Measurement Menu Y PRMITTVTY ET E id frin Ern PERMITTVTY 0 5 0453 E riang i SINGLE ary DONE PARAMETER MODIFIED RETURN FIXTURE 16453 Dielectric Material MATERIAL Size Menu SIZE Dual Parameter Menu Dielectric Material Measurement ME NONE THICKNESS Dielectric Material Fixture Menu CE005060 Figure 5 3 Softkey Menus Accessed from the Meas Key for Permittivity Measurement 5 4 Measurement Block Wess PRMITTVTY 7 IMPEDANCE REAL r MAG z ADMNINCE REFL COEF IGAPACITNCE PHASE MAS IYI MAGUED LOSS FACIS 02 PHASEL RESIST R RESISTNCE PRE Cp PRL Rp PHASE er SER Cs SERIRS CONDUCT S LOSS TNGNT REAL FX INDUCTNCE REACT X D FACTOR t m C PRL Lp ang SUSCEPT B MAGGI PRL L D MAD MORE MORE NGHE SER Ls QFACTOR 4l MORE MORE 516
14. MEMORY SCALING TRACE PROCESS e NORMAL FLOW DATA ARRAYS gt CONDITIONED FLOW C6009001 Figure 9 2 Data Processing AD converter Apc The apc converts an analog signal which is already down converted to a fixed low frequency IF into digital data Digital Filter The digital filter detects the IF signal by performing a discrete Fourier transform DFT on the digital data The samples are converted into complex number pairs real plus imaginary R jX that represent both the magnitude and phase of the IF signal Analyzer Features 9 3 Data Processing 9 4 Analyzer Features Ratio Processing The ratio processing calculates the ratio of the current and voltage values V I in order to convert them to an impedance value Fixed Point Calibration Coefficient Arrays and User Defined Point Calibration Coefficient Arrays When a calibration measurement is performed the coefficient values at each calibration measurement point are stored in these arrays These arrays are not accessible via GPIB Calibration Coefficient Interpolation When calibration measurements have been performed or stimulus settings have been changed the calibration coefficients at the current measurement points are calculated from either the fixed point calibration coefficient arrays or the user defined point calibration coefficient
15. DC BIAS M DC BIAS SWP TYPE Het RETURN SWEEP DIR UP LIST MENU Sweep Menu CE006010 SWEEP TIME AUTO RETURN LIST DISP FREQ BASE ORDER BASE EDIT LIST Y SEGMENT EDIT DELETE ADD CLEAR LIST p CLEAR LIST YES NO RETURN E d List Menu SEGMENT MKR START MKR gt S TOP NUMBER of POINTS OSC LEVEL AVERAGING ON POINT MORE SEGMENT QUIT SEGMENT DONE SEGMENT START STOP CENTER SPAN RETURN Segment Menu Figure 6 2 Softkey Menus Accessed from the Key Stimulus Block 6 3 Sweep Menu 6 4 Stimulus Block SWEEP TIME AUTO i SWEEP TIME AUTO dms RETURN POINT DELAY TIME SWEEP DELAY TIME NUMBER of POINTS COUPLED CH ON off SWEEP MENU SWP SRC FREQ OSG LEVEL BC BIAS V DC BIAS I SWP TYPE LIN Los LIST RETURN SWEEP DIR UP wet Figure 6 3 Sweep Menu SWEEP TIM
16. Y axis Reference Value Position is fixed Y a 5 50 Measurement Block User Trace Scale Menu Scale Ref Scale Ref AUTO SCALE AXIS COUPLE Figure 5 39 User Trace Scale Menu This menu can be accessed when the user trace is turned on AUTO SCALE Brings the trace data in view on the display with one keystroke The analyzer determines the smallest possible scale factor that will put all displayed data onto the graticule LEFT VALUE Changes the value at the left line of the graticule moving the current selected user trace correspondingly RIGHT VALUE Changes the value at the right line of the graticule moving the current selected user trace correspondingly TOP VALUE Changes the value at the top line of the graticule moving the current selected user trace correspondingly BOTTOM VALUE Changes the value at the bottom line of the graticule moving the current selected user trace correspondingly AXIS COUPLE Couples or uncouples all user traces to be scaled along the x and y axes by prior functions in this menu COUPLE Shows parameters for the x and y axes of all user traces are coupled to the current selected user trace setting UNCOUPLE Shows parameters for the x and y axes of each user trace can be set individually Measurement Block 5 51 Averaging Menu 5 52 Measurement Block
17. Point delay time Sweep delay time 4291B RF Impedance Material Analyzer Technical Data 12 3 Permeability Measurements Measurement circuit mode series circuit mode parallel circuit mode Calibration Compensation Calibration function MEME Open Short 50Q0 calibration Low loss calibration Compensation function Open Short Load compensation Port extension Electric length 124 4291B RF Impedance Material Analyzer Technical Data Permeability Measurements Measurement Accuracy Conditions of accuracy specifications Open Short 50 Q calibration must be done Calibration ON Averaging on point factor is larger than 32 at which calibration is done if Cal points is set to USER DEF Measurement points are same as the calibration points accuracy is twice as bad as specified Environment temperature is within 45 C of temperature at which calibration is done and within 13 C to 33 C Beyond this environmental temperature condition Z Y Accuracy sese Ea Ep The illustrations of Z and Y accuracy are shown in Figure 12 2 to Figure 12 5 L Ea T E 6 ACCUPACY coco 100 rad L C X B Accuracy E Ep x yd D2 95 R G Accuracy E Ep x YU Q2 96 D Accuracy AD 1 D2 tan E Ea Ey v 100 Ds tan 3 100 1xzD tan
18. CONTINUOUS TRIGGER FREE RUN i TRIGGER FREE RUN EXTERNAL MANUAL TRIG EVENT ON SWEEP TRIG PLRTY POS neg RETURN MEASURE RESTART Figure 6 8 Softkey Menus Accessed from the Trigger Key SWEEP HOLD Freezes the data trace on the display and the analyzer stops sweeping and taking data The notation H1d is displayed at the left of the graticule If the indicator is on at the left side of the display trigger a new sweep by pressing SINGLE SINGLE Makes one sweep of the data and returns to the hold mode NUMBER of GROUPS Selects the group sweep and makes the number of groups the active function After the number of groups is entered and the analyzer is triggered the analyzer sweeps a user specified number and returns to the hold mode If averaging on sweep is oN set the number of groups at least equal to the selected averaging factor to allow the measurement of a fully averaged trace Entering the number of groups resets the averaging counter to 1 CONTINUOUS Selects the continuous mode In this mode the analyzer sweeps automatically and continuously the trace is updated with each sweep TRIGGER Displays the following softkeys which are used to select the trigger source and to select trigger event mode The trigger source is common to both channels Trigger The BUS tri
19. CH1 MEM LIMIT EN m und CH2 DATA a m CALCULATE EOV PARAMS SIMULATE FSCHRSTI RETURN x CH3 MEM LIME LN GRAT ICULE WARNING ji MORE y TEXT MARKER PARAMETER Ra et L1 Eb SIMULATE FSCHRST RETURN CALCULATE EQ PARAMS IBASICH MOR PEN 1 PENZ pom PEN 3 SIMULATE FCHRST RETURN Equivalent Circuit Menu Data Math Menu SELECT LETTER SPACE Emm PEN 4 puru PENS mmm PEN 6 RETURN RETURN RETURN DEFAULT COLORS coLONS RECALL COLORS RETURN Adjust Display Menu LABEL HNE BRIGHTNESS COLOR RESET COLOR RETURN Color Adjust Menu COLOR X POS Y ROS LABEL NUMBER CLEAR ALL LABEL RETURN BACK SPACE ERASE TLE DONE CANCEL Title Menu Label Menu Fi
20. Parallel Series Equivalent Circuit Conversion Selecting Circuit Mode of Capacitance Small Capacitance 2 Large Capacitance Selecting Circuit Mode of Inductance Large Inductance o o Small Inductance eee es Smith Chart Calibration Concepts 0 02 OPEN SHORT LOAD Calibration Ideal Measurement Circuit General Impedance Measurement Schematic Low Loss Capacitor Calibration Port Extension llc n Fixture Compensation 2 2 Actual Measuring Circuit Residual Parameter Effects Characteristics of Test Fixture Electrical Length of Coaxial Coupling Terminal Section 2 2 2 lh Elimination of Electrical Length Effects in Test Fixture 2 2 2 2 2 52 2 Residual and Stray Parameters of Contact Electrode Section 2 2 2 lh 10 5 Contents 7 Contents 8 12 Elimination of Residual Parameter Effects in Test Fixture Fixture Compensation 11 21 Compensation Coefficient for Each Compensation 11 22 OPEN Compensation 11 22 SHORT Compensation 2 11 22 LOAD Compensation 0 11 23 OPEN SHORT Compensation 11 23 OPEN LOAD Compensation 11 24 SHORT LOAD Compensation
21. sess 0 dBm typically Output Impedance s 50 9 nominal Connector coo BNC female 12 22 4291B RF Impedance Material Analyzer Technical Data Option 002 Material Measurement Supplemental Characteristics for Option 002 Material Measurement Measurement Frequency Range Using with 16453A 1 MHz to 1 0 GHz Typical O Using with 16454A 1 MHz to 1 0 GHz Typical Measurement Parameter Permittivity parameters o lec Er Er tan o luz Wr uz tan Typical Measurement Accuracy Conditions of accuracy characteristics Use the High Z Test Head for permittivity measurement Use the Low Z Test Head for permeability measurement OPEN SHORT 50 Q calibration must be done Calibration ON Averaging on point factor is larger than 32 at which calibration is done if Cal points is set to USER DEF m Measurement points are same as the calibration points if Cal point is set to USER DEF Environment temperature is within 45 C of temperature at which calibration is done and within 13 C to 33 C Beyond this environmental temperature condition accuracy is twice as bad as specified i ey Accuracy m tan lt 0 1 eus 5 104 t 0 25 4 a ya 1 Typical Erm m NES Loss Tangent Accuracy of Atan tand lt OL oo e E Ey Typical Where frequency lt 1 GHz
22. 10M 100M Frequency Hz Figure 12 26 Typical Permeability Measurement Accuracy QF 23 F hinf 10M 108M Frequency Hz Figure 12 27 Typical Permeability Measurement Accuracy QF 10 12 32 4291B RF Impedance Material Analyzer Technical Data Option 002 Material Measurement E w o LL O c 10M Frequency Hz CE001221 Figure 12 28 Typical Permeability Loss Tangent tan Measurement Accuracy QF 20 5 F h In Note a This graph shows only frequency dependence of E to simplify it The typical accuracy of tan is defined as E E refer to Supplemental Characteristics for Option 002 Material Measurement 4291B RF Impedance Material Analyzer Technical Data 12 33 Option 002 Material Measurement Hr rr 10 N A Sr 30 N H N B DUX MqrrO0 x q x N EMEN N H r 300 ei wed M UR M s x r 1000 Pul RepUUUU k E MS v ES 10M 100M Frequency Hz 5 w o LL O c ou CE001222 Figure 12 29 Typical Permeability Loss Tangent tan Measurement Accuracy F 3 Note a This graph shows only frequency dependence of E to simplify it The Y typical accuracy of tan is defined as E E refer to Supplemental Characteristics for Option 002 Material Measurement 12 34 4291B RF Impedance Material Analyzer Technical Data
23. CE005028 CAL KIT m CAL KIT 7 mm Selects the 7 mm cal kit the furnished cal kit model USER KIT Selects a cal kit model modified and stored into memory using SAVE USER KIT by the user SAVE USER KIT Stores the current cal kit into memory as USER KIT after it has been modified MODIFY Displays the following softkeys which are used to modify standard definitions O DEFINE STANDARD Leads to the following softkeys which are used to define the OPEN SHORT and LOAD m OPEN CONDUCT G Makes conductance value G of OPEN the active function m CAP C Makes capacitance value C of OPEN the active function m SHORT RESIST R Make resistance value R of SHORT the active function m INDUCT L Makes inductance value L of SHORT the active function m LOAD RESIST R Make resistance value R of LOAD the active function m REACT X Make reactance value X of LOAD the active function m STD DONE DEFINED Terminates the standard definition press this after each standard is defined LABEL KIT Leads to the Letter menu to define a label for a new calibration kit This label appears in the CAL KIT softkey label 5 60 Measurement Block in the Calibration menu and the MODIFY label in the Cal Kit menu It is saved with the cal kit data o KIT DONE MODIFIED Completes the procedure to define a current cal kit L O SHORT 26005042 Figure 5 47 Calibration Standard Model
24. requires that the Amarker mode be turned ON NO MEMORY TRACE The MARKER ON MEMORY CALCulate EVALuate 0N1 TR 2 17 is selected when the memory trace is not displayed NO MEMORY TRACE DISPLAYED The SCALE FOR MEMORY DISPlayL WINDow TRACet2 17 Y SCALe is selected when the memory trace is not displayed NO STATE DATA IBASIC FILES ON DISK Front panel key only The RE SAVE FILE COPY FILE PURGE FILE or Recall key pressed but there are no files with extensions _D or _S for LIF format or STA or DAT for DOS format on the floppy disk NO STATE DATA IBASIC FILES ON MEMORY Front panel key only The RE SAVE FILE COPY FILE PURGE FILE or Recall key pressed but there are no files with extensions _D or _S for LIF format or STA or DAT for DOS format on the memory disk NO TEST HEAD CONNECTED Check the test head connection NO VALID MEMORY TRACE If memory traces are to be displayed or otherwise used a data trace must first be stored to memory NO VALID USER TRACE The marker cannot be used in user trace because the selected user trace is OFF NOT ALLOWED IN DC BIAS SWEEP The calibration CAL POINTS USER SENSe CORRectioni COLLect FPOints USER or compensation in COMP POINT USER SENSe CORRection2 COLLect FPOints USER cannot be executed in the DC V DC I sweep Messages 13 Temperature Coefficient Measurement Messages 14 121
25. 2 2 Purge Ys No Menu 2 0484 Initialize Ys No Menu Recall Menu 1 1 e The Concept of Segments as a Point between Two Sets of Limit Lines 04 Analyzer Bus Concept rn File Header Structure 0 RAW DATA and DATA TRACE Data Group Structure CAL Data Group Structure MEMORY and MEMORY TRACE Data Group Structure User Trace Data Group Structure Analyzer Simplified Block Diagram Data Processing 2 Definition of Impedance Vector Representation of Admittance Small Capacitance Circuit Mode Selection Large Capacitance Circuit Mode Selection Large Inductance Circuit Mode Selection Small Inductance Circuit Mode Selection Smith Chart Impedance Read out Phase Sift by Transmission Line Contents 13 Contents 14 11 10 11 11 11 12 11 13 11 14 11 15 11 16 11 17 11 18 11 19 11 20 11 21 11 22 11 23 12 1 12 2 12 3 12 4 12 5 12 6 12 7 12 8 12 9 12 10 12 11 12 12 12 13 12 14 12 15 12 16 12 17 Measurement Circuits for I V Method 11 12 General Schematic for Impedance Measurement Using Two Vector Voltmeters 11 13 Modifying the Standard Value of a 50 Q LOAD using a Low Loss
26. ADJUST DISPLAY Provides a menu for adjusting display intensity colors and accessing save and recall functions for modified display color sets FREQUENCY BLANK Blanks the displayed frequency notation for security purposes Frequency labels cannot be restored except by pressing or by turning the power off and then on Measurement Block 5 35 Display Allocation Menu 5 36 Measurement Block DISPLAY 7 ALL ALLOCATION INSTRUMENT HALF INSTR HALF BASIC ALL BASIC BASIC STATUS GRAPHICS BASIC DRAW ALL MEMORY TRACE RETURN Figure 5 29 Display Allocation Menu ALL INSTRUMENT Selects a full screen or two half screen graticules HALF INSTR HALF BASIC Selects two half screens one graticule display above the HP Instrument BASIC display ALL BASIC Selects a full screen single HP Instrument BASIC display BASIC STATUS Selects a full screen graticule and three status lines for HP Instrument BASIC under the graticule GRAPHICS BASIC DRAW Makes Instrument BASIC graphic capability available Because the Instrument BASIC graphic capability uses the same resources as the memory trace capability the analyzer cannot display memory traces except for a memory trace selected using SELECT MEMORY NO when this softkey is selected ALL MEMORY TRACE Makes all memory trace displays available Because the multiple memory trace display capability uses the same resources as the Instrument BASIC graphic
27. Gp Y Gp jwCp L o t E r Er jer Figure 11 18 Material has some loss Therefore the relative permittivity of the MUT can be obtained using the following equation 1 Ym t Er 24 En Jw S 11 26 Impedance Measurement Basics Permittivity Measurements Ym jwCo 11 73 Where Ym is the measurement admittance value of the MUT Co is the capacitance value of the air gap whose distance between electrodes is same as the thickness of the MUT Co TE 11 74 Characteristics of Test Fixture Edge Effect When the capacitance of the material is measured stray capacitance exists at edge of electrodes see Figure 11 19 MUT Edge Effect conos Figure 11 19 Edge Effect Because measurement result is a summation of the capacitance of a MUT and the stray capacitance caused by the edge effect the edge effect is generally expressed as follows Coll Eedge 11 75 Where Eeage is the compensation coefficient for the edge effect which is determined by the gap between electrode and relative permittivity of MUT Adding the edge effect to Co in equation 11 73 the relative permittivity of the MUT can be obtained by using the following equation Yin 11 76 juCo l Eeage r Impedance Measurement Basics 11 27 Permittivity Measurements 11 28 Impedance Measurement Basics The Analyzer uses an approximat
28. 11 24 OPEN SHORT LOAD Compensation 11 24 Permittivity Measurements 11 26 Complex Permittivity 11 26 Characteristics of Test Fixture 11 27 Edge Effect 2 2 2 2 11 27 Residual Parameter 11 28 Permeability Measurements 11 29 Complex Permeability 11 30 Characteristics of the Test Fixture 11 31 Residual Parameter 11 31 Elimination of Residual Impedance Effects in the Test Fixture SHORT Fixture Compensation 11 31 Impedance Parameter Value Displayed for Magnetic Material Measurement 4 11 32 4291B RF Impedance Material Analyzer Technical Data Measurement Parameter 12 1 Impedance parameters 12 1 Stimulus Characteristics l l 12 1 Frequency Characteristics c 12 1 Source Characteristics n 12 1 Sweep Characteristics lll sn 12 3 Calibration Compensation 2 2 12 4 Measurement Accuracy 2 2 00 12 5 Specification for Option 013 and 014 High Temperature Test Heads 12 11 Frequency Characteristics c 12 11 Source Characteristics 0 008 12 11 Basic Measurement Accuracy 12 12 Typical Effects of Temperature Drift on Measurement Accuracy 0 0 4 4 4 4 4
29. aL SPACE COMPEN KIT MODIFY ue ERASE o mea THEE DONE CANCEL Figure 5 36 Title Menu SELECT LETTER Selects the letter pointed to by the arrow 1 on the screen The arrow can be moved by rotating the knob SPACE Inserts a space in the title BACK SPACE Deletes the last character entered ERASE TITLE Deletes the entire title DONE Terminates the title entry and returns to the display more menu CANCEL Cancels the title entry and returns to the display more menu without any change bigis User Trace Display Menu Display ALLOCATION gt Display Allocation Menu SERE I3 DATA USER MEMORY gt USER SELECT UTRE 1 SEL D UTRC on OFF CLEAR ALL UTRC RETURN HABEL Label Menu USER TRACE LABEL HEADLINE FOOTNOTE Y UNIT LABEL X UNIT LABEL RETURN TRACE USER ABUUST Adjust Display Menu RETURN Figure 5 37 User Trace Display Menu CE005062 This menu can be accessed when the user trace is turned on m DISPLAY ALLOCATION Displays the Display Allocation menu which is used to allocate the BASIC screen area on the display m DEFINE TRACE Leads to the following softkeys which are used to select traces displayed the data and memory traces a
30. o o o o 0 1 9 6 4 mV lac ma X 9 Qi mV Current 0 5 30 pA Vac v 10 n Qj mA 8 to 18 C and 28 to 38 C Voltage o 0 2 8 mV lac ma x 10 Q mV Current 1 60 pA Vac v5 Ko mA 0 to 8 C and 38 to 40 C Voltage 0 3 12 mV lac ma x 15 Qi mV Current 1 5 90 pA Vac v x 3 10 n Qj mA Level monitor Monitor parameters OSC level voltage current DC bias voltage current Monitor accuracy OSC level sssss Same as OSC level accuracy typical DC bias Twice as bad as specifications of dc level accuracy typical Current A 06600009 Figure 12 1 DC Voltage and Current Level Range Typical Sweep Characteristics Sweep parameter Frequency OSC level voltage DC bias voltage current Sweep setup esses Start Stop or Center Span Sweep type Frequency sweep 2000 Linear Log Zero span List Other sweep parameters Linear Log Zero span Sweep mode Continuous Single Manual Number of groups Sweep direction AC level DC bias voltage and current Up sweep Down sweep Other sweep parameters 0 0 00 0 cee esee Up sweep Number of measurement point 2 to 801 points Averaging ss esses Sweep average Point average Delay time
31. 2 13 5 Heat Sink Sinks heat of the test station When you install the test station you keep space around heat sink in order to radiate heat as shown in Figure 2 7 Figure 2 7 Keeping Space Around the Heat Sink 6 Test Station Mounting Screws Fixes the test station to the peripheral such as handler See Figure 2 8 for the dimensions of the test station mounting screws Figure 2 8 Dimensions of Test Station 2 14 Front and Rear Panel Test Station and Test Heads Test Heads 4291B TEST HEAD HIGH IMPEDANCE LOW IMPEDANCE 4291B TEST HEAD CE002007 1 Connectors 2 APC 7 Connector 3 Knobs Figure 2 9 Test Heads Connects to the test station Connects to a test fixture These terminals comply with INSTALLATION CATEGORY I of IEC 1010 1 Fixes the test head to the test station High Impedance Measurement Test Head This test head is designed to measure high impedance with better accuracy As a guide when the impedance value of a DUT is grater than about 300 Q use the hi
32. An external test 25 FRONT ISOL N fails See the Service Manual for troubleshooting GET not allowed A Group Execute Trigger GET was received within a program message see IEEE 488 2 7 7 GND LEVEL OUT OF SPEC An internal test 4 A2 POST REGULATOR fails The voltage of the GND Ground at the DC bus node 26 is out of its limits See the Service Manual for troubleshooting Hardware error A legal program command or query could not be executed because of a hardware problem in the analyzer Definition of what constitutes a hard ware problem is completely device specific This error message is used when the analyzer cannot detect the more specific errors described for errors 241 through 249 Hardware missing A legal program command or query could not be executed because of missing analyzer hardware For example an option was not installed Header separator error A character that is not a legal header separator was encountered while parsing the header For example no white space followed the header thus SRE4 is an error HIGH TMP HIGH Z HEAD TEST FAILED An external test 32 HIGH TMP HIGH Z HEAD TEST FAILED fails See the Service Manual for troubleshooting HIGH TMP LOW Z HEAD TEST FAILED An external test 33 HIGH TMP LOW Z HEAD TEST FAILED fails See the Service Manual for troubleshooting HIGH Z HEAD TEST FAILED An external test 30 HIGH Z HEAD fails See the Service Manual for troubl
33. COMMAND IGNORED SEGMENT NOT DONE YET GPIB only The GPIB command the analyzer received is ignored because the segment is editing Send CALCulate LIMit SEGMemt SAVE limit segment done or SENSe LIST SEGMent SAVE segment done to terminate editing segment COMPENSATION ABORTED The compensation in progress was terminated due to a change of the stimulus parameter or calibration measurement points For example m Changing COMP POINT FIXED between COMP POINT USER SENSe CORRection2 COLLect FPOints FIXed USER before pressing DONE COMPEN SENSe CORRection2 COLLect SAVE COMPENSATION REQUIRED No valid fixture compensation coefficients were found when you attempted to turn fixture compensation ON OPEN ON off SENSe CORRection2 0PEN ON SHORT ON off SENSe CORRection2 SHORt ON LOAD ON off SENSe CORRection2 LOAD ON See Users Guide for information on how to perform compensation COMPENSATION STD LIST UNDEFINED GPIB only You cannot execute SENSe CORRection2 CKIT 1 STANdard 1 3 SELect LIST when the fixture compensation standard array is not defined CORR CONST DATA LOST DEFAULT DATA IS USED This message is displayed when the correction constants EEPROM data is lost and turned on in the service mode See the Service Manual for troubleshooting CORR CONST DATA LOST DEFAULT DATA IS USED This message is displayed when the correction constants EEPROM data is lost and turned on in the
34. MKR VALUE WIDTH VALUE MKRVAL x 1 2 WIDTH VALUE MKRVAL 2 Figure 7 14 Q Measurement Examples There are two kinds of Q parameters Generally two kinds of Q factors are used to characterize electric devices the impedance parameter Q factor and the Q value of a coil or resonator However these Q factors are quite different The definitions of them are as follows Q factor of Impedance Parameter This Q factor is ratio of the resistance and reactance or conductance and suceptance JX Where R is resistance X is reactance Q value of Width Parameter This Q factor is the ratio of the bandwidth and center frequency of the trace BW E BW JIAN Q CENTER CENTER Where BW is bandwidth CENTER is center frequency Marker Block 7 25 Marker Function Peak Definition The search function provides the define peak feature which specifies the properties of the peaks searched for by the peak search function The define peak feature also allows the peak search function to discriminate peaks from noise Peak Definition The following parameters are used in the peak definition m Peak polarity positive or negative m AX AY gradient m Threshold value The search functions search for a peak where the parameters of the peak match the following conditions BUSCAN lt min AyL Ayr and Threshold Peak Amplitude Value Where Ay and Ayr are the difference in amplitude value between a peak and
35. Measurement Block 5 61 Compen Kit Menu for Inpedance Measurement Fixture COMPEN KIT GOMPEN KIT MODIFY USER USER DEFINE STANDARD i OPEN CONDUCTIG CAPAC SHORT RESIST R INDUCT L LOAD RESIST R INDUCT L STD DONE DEFINED LABEL KIT Letter Menu KIT DONE MODIFIED RETURN Figure 5 48 Compen Kit Menu for Impedance Measurement Fixture SAVE COMPEN KIT Stores the user modified or user defined OPEN SHORT and LOAD for fixture compensation into memory after it has been modified m MODIFY Leads to the following softkeys which are used to modify a default definition of OPEN SHORT and LOAD for the fixture compensation O DEFINE STANDARD Leads to the following softkeys which are used to define the parameters of OPEN SHORT and LOAD for the fixture compensation m OPEN CONDUCT G Makes conductance value G of OPEN the active function m CAP C Makes capacitance value C of OPEN the active function m SHORT RESIST R Makes resistance value R of SHORT the active function m INDUCT L Makes inductance value L of SHORT the active function m LOAD RESIST R Makes resistance value R of LOAD the active function m INDUCT L Makes inductance value L of LOAD the active function m STD DONE DEFINED Completes the procedure to define user defined OPEN SHORT and LOAD 5 62 Measurement Block LH LABEL
36. Note uy When it is difficult to connect the device to the test fixture that is in the chamber remove the test fixture from the test fixture stand Then connect the device outside the chamber and set the fixture on the test fixture stand again When the test fixture is ready for the SHORT compensation sequence press the following front panel keys 1 Press Cal FIXTURE COMPEN COMPEN MENU 2 Press SHORT After the SHORT compensation sequence is done the SHORT softkey label is underlined Open Compensation C6201032 N C6201021 1 Remove the shorting device 2 Adjust the stage and the pressure arm to fit your DUT 06201023 C6201024 3 Move the pressure arm to the outside 4 Turn the latch knob and insert it into the hole so that the pressure is locked When the test fixture is ready for the Open compensation sequence perform the following procedure C 6 Option 013 014 Temperature Coefficient Measurement Note uy Temperature Coefficient Measurement 1 Press OPEN After the OPEN compensation sequence is done the OPEN softkey label is underlined 2 Press DONE COMPEN if you do not intend to perform the Load compensation If you use both t
37. These keys define the start value the stop value the center value and the span value of the frequency range OSC level range or dc bias range of the stimulus When one of these keys is pressed its function becomes the active function The value is displayed in the active entry area and can be changed with the knob step keys or numeric keypad Current stimulus values for the active channel are also displayed along the bottom of the graticule The range can be expressed as either start stop or center span Marker Block The marker block keys and associated menus provide control of the marker function The following list shows the functions controlled by each key in the maker block MARKER Marker Marker gt oao 06007001 Figure 7 1 Marker Block Controlling the marker sub markers and delta marker Coupling markers on both channels Marker Changing stimulus value and amplitude values to the current marker s value Zooming traces Searching for peak maximum minimum or point specified by amplitude value Setting peak definition Listing marker values Calculating statistics value Displaying marker time Selecting marker form for Smith polar and admittance chart Marker Block 7 1 Functions accessed from this block You can access See the following section in this from chapter Amarker Marker Marker Menu Coupling marker Marker Marker Menu Level monitor Utility Util
38. 0 002 BE t 1 0 004f 4 a a Erm ive Typical frequency gt 1 GHz 0 002 A 0 0047 x H rm VEM Typical Acim l 0 002 E C jog Em tan Typical 4291B RF Impedance Material Analyzer Technical Data 12 23 Option 002 Material Measurement f is measurement frequency GHz t is thickness of MUT mm Erm is measured value of e tan is measured value of dielectric loss tangent Apr an rm py Accuracy 1 e Fils 1 0 f Typical tan lt 0 1 4 o lt Hrm F hpm Loss Tangent Accuracy of j Atan tanb lt O 1 nananana aeaaaee e Ea Es Typical Where 0 001 Pm S E 0 002 0 004f Typical Ay tan 6 mL T l E uL 100 Typical f is measurement frequency GHz F hin gt mm h is the height of MUT mm b is the inner diameter of MUT c is the outer diameter of MUT tan 6 is the measured value of loss tangent Urm is the measured value of permeability At the following frequency points instrument spurious characteristics could occasionally cause measurement errors to exceed specified value because of instrument spurious characteristics 10 71 MHz 17 24 MHz 21 42 MHz 42 84 MHz 514 645 MHz 686 19333 MHz 1029 29 MHz 1327 38666 MHz See EMC under Others in General Characteristics 12 24 4291B RF Impedance Material Analyzer Technical Data Option 002 Material Measurement t
39. 5 5 5 6 5 7 5 8 5 9 5 11 5 12 5 14 5 15 5 17 5 19 5 20 5 21 Contents 11 Contents 12 5 17 5 18 5 19 5 20 5 21 5 22 5 23 5 24 5 25 5 26 5 27 5 28 5 29 5 30 5 31 5 32 5 33 5 34 5 35 5 36 5 37 5 38 5 39 5 40 5 41 5 42 5 43 5 44 5 45 5 46 5 47 5 48 5 49 5 50 5 52 6 1 6 2 6 3 6 4 6 5 6 6 6 7 6 8 7 1 1 2 7 3 1 4 Dielectric Material Size Menu Option 002 only Dielectric Material Size Permeability Measurement Menu Option 002 only Complex Permeability Measurement Menu Option 002 only MEL Dual Parameter Menu Magnetic Material Measurement Magnetic Material Fixture Menu Option 002 only Magnetic Material Size Menu Option 002 only Magnetic Material Size D Format Menu 2 lll en User Trace Format Menu Softkey Menu Accessed from Key Display Menu 2 2 2 2 2 2 2 Display Allocation Menu o Display Allocations ZEND Data Math Menu 2 2484 Equivalent Circuit Menu Adjust Display Menu Color Adjust Menu Label Menu 2 2 2 2 2 Title Menu ML User Trace Display Menu MED D Scale Reference Menu User Trace Scale Menu s Averaging Menu 2 2 2 2 2 Softkey Menu Accessed from Cal key oes C
40. COPY TIME on OFF PRINT SETUP ORIENT PORTRAIT FORMFEED ON off MORE LIST VALUES OPERATING PARAMETERS CAL KIT DEFINITION COMPEN KIT DEFINITION LIST SWEEP TABLE LIMIT TEST TABLE RETURN PRINT STANDARD COLOR PRINT COLOR FIXED DPI TOP MARGIN LEFT MARGIN DEFAULT SETUP RETURN Print Setup Menu Copy Menu 8 22 Instrument State Block DISPLAY LIST DISP MODE ST amp SP CIR amp SPAN RETURN Copy List Sweep Menu DISPLAY ERST DISP MODE UPR amp LWR 1 MID amp DET RETURN Copy Limit Test Menu Figure 8 12 Softkey Menus Accessed from the Key PRINT STANDARD COPY ABORT COPY TIME on OFF NEXT PAGE PREV PAGE RESTORE DISPLAY Screen Menu Copy Menu CE008022 PRINT STANDARD COPY ABORT COPY SKEY on OFF COPY TIME on OFF PRINT Cony SETUP ORIENT PORTRAIT FORMFEED ON off Mone LIST VALUES OPERATING PARAMETERS CAL KIT DEFINITION COMPEN KIT DEFINITION LIST SWEEP TABLE d Print Setup Menu Copy List Sweep Menu H Copy Limit Test Menu LIMIT TEST TABLE RETURN Figure 8 13 Copy Menu m PRINT STANDARD Causes an exact copy of the display to be printed The softkey label identifies the printer selected in the
41. LABEL FIXTURE KIT DONE MODIFIED RETURN Impedance Fixture Menu CE005006 Figure 5 2 Softkey Menus Accessed from the Meas Key for Impedance Measurement Measurement Block 5 3 PRMITTVTY i IMPEDANCE REAL er MAG z APMITINCE REFL COEF 7 l MAG Y MASUR A Pen RESISTNCE LOSS FACTR PHASHA PHASE ui lav Loo erl RESISTR Eonpuerial PHASE SER Es SER RS LOSS TNGNT REAL INDUCTNEE tang UREACT X SUSCEPTB PRL Lp dc i IMAG TY MAG lerl 216 MORE MORE SER Ls QFACTOR Q sie 46 MORE MORE ES MORE 6 6 DUAE PARAMETER FIXTURE 16453 MATERIAL SIZE DUAL PARAMETER IXTURE 16453 MATERIAL SIZE DUAL FIXTURE 116453 MATERIAL SIZE DUAL PARAMETER FIXTURE 16453 MATERIAL SIZE
42. SWEEP AVG RESTART SWEEP AVG ON off SWEEP AVG FACTOR POINT AVG on OFF POINT AVG FACTOR Figure 5 40 Averaging Menu SWEEP AVG RESTART Resets the sweep to sweep averaging and on point averaging and restarts the sweep count at 1 at the beginning of the next sweep The sweep count for averaging is displayed at the left of the display SWEEP AVG ON off Turns the sweep to sweep averaging function ON or OFF for the active channel When averaging is on Avg is displayed in the status notations area at the left of the display along with the sweep count for the averaging factor Whenever an instrument state change affecting the measured data is made the sweep count for averaging is reset to 1 At the start of averaging or following AVERAGING RESTART averaging starts at 1 and averages each new sweep into the trace until it equals the specified averaging factor The sweep count is displayed in the status notation area below Avg and updated each sweep as it increments When the specified averaging factor is reached the trace data continues to be updated weighted by that averaging factor SWEEP AVG FACTOR Makes the sweep to sweep averaging factor the active function Any value up to 999 can be used POINT AVG on OFF Turns the on point averaging function oN or OFF for the active channel POINT AVG FACTOR Makes the point averaging factor the active function Any value up to 999 can be used Averagi
43. You cannot execute CAL POINTS FIXED SENSe CORRection1 COLLect FPOints FIXed or COMP POINT FIXED SENSe CORRection2 COLLect FP ints FIXed when the high temperature test head is connected CAN T SAVE GRAPHICS WHEN COPY IN PROGRESS If you attempt to save graphics when a print is in progress this error message is displayed Wait until print is complete then save graphics again Cannot create program An attempt to create a program was unsuccessful A reason for the failure might include not enough memory Character data error This error as well as errors 141 through 148 are generated when analyzing the syntax of a character data element This particular error message is used if the analyzer cannot detect a more specific error Character data not allowed A legal character data element was encountered where prohibited by the analyzer Character data too long The character data element contains more than twelve characters see IEEE 488 2 7 7 1 4 Command error This is a generic syntax error that the analyzer cannot detect more specific errors This code indicates only that a command error as defined in IEEE 488 2 11 5 1 1 4 has occurred Messages 3 Temperature Coefficient Measurement Messages 4 110 67 Command header error An error was detected in the header This error message is used when the analyzer cannot detect the more specific errors described for errors 111 through 119
44. front panel and can be used only if no active system controller is connected to the system through GPIB If you try to set system controller mode when another system controller is present the message CAUTION CAN T CHANGE ANOTHER CONTROLLER ON BUS is displayed m ADDRESSABLE ONLY Sets the analyzer as addressable only This mode is used when an external controller controls peripheral devices or the analyzer m SET ADDRESS Displays the following softkeys O ADDRESS 4291 Sets the GPIB address of the analyzer There is no physical address switch to set in the analyzer D ADDRESS CONTROLLER Sets the GPIB address the analyzer will use to communicate with the external controller Instrument State Block 8 19 The analyzer keeps the setting of the GPIB mode and GPIB addresses in the battery backup memory even if the analyzer is turned off 8 20 Instrument State Block key presets the instrument state to the preset default value The preset default values are listed in Appendix B has no effect on the following states m Display Allocation m Display Adjustment m Color Adjustment m Clock Time Date m Limit Line Table m GPIB Address m GPIB Mode system controller and addressable m User Cal Kit Definition m User Compensation Kit Definition m Fixture Selection Impedance Permittivity and Permeability Instrument State Block 8 21 CE008011 PRINT STANDARD COPY ABORT COPY SKEY on OFF
45. m lurl tan Measures u on channel 1 and measures tan on channel 2 SINGLE PARAMETER Leads to the Permiability Measurement Menu FIXTURE 16454 Leads to the Magnetic Material Fixture Menu which is used to select test fixture used with the analyzer The selected test fixture is displayed in brackets in the softkey label MATERIAL SIZE Leads to the Material Size Menu which is used to set the diameters of the magnetic material to be measured 5 26 Measurement Block Magnetic Material Measurement Magnetic Material Fixture Menu Option 002 only IMPEDANCE NONE FIXTURE 116454 PERMITTIVITY 16453 PERMEABETY 16454 5 SELECT FIXTURE i FIXTURE 16454 S 16454 L RETURN RETURN d CE005038 Figure 5 22 Magnetic Material Fixture Menu Option 002 only This section describes the softkeys that can be accessed when Option 002 Material Measurement is installed and PERMEABILITY 16454 is selected in this menu m IMPEDANCE Selects the impedance measurement When this softkey is selected the menu accessed from the SELECT FIXTURE softkey lists only impedance fixtures The and keys lead only to the menus related to the impedance measurement When a fixture has been specified its label is displayed in brackets in the softkey label m PERMITTVTY 16453 Selects t
46. whenever the data is updated and when limit testing is first turned ON Limit testing is available for both magnitude and phase values in Cartesian formats In the polar Smith admittance chart and complex plane formats the value tested depends on the marker mode and is the magnitude or the first value in a complex pair The message NO LIMIT LINES DISPLAYED is displayed in polar Smith admittance chart and complex plane formats if limit lines are turned oN 8 14 Instrument State Block System Four different ways to indicate pass or fail status When limit testing is ON the following four different indications of pass or fail status are provided e A PASS or FAIL message is displayed at the right of the display e The limit beeper sounds if it is turned on e Ina listing of values using the copy menu an asterisk is shown next to any measured point that is out of limits e A bit is set in the GPIB status byte BEEP Leads to the following softkeys which are used to turn on or off the limit pass or fail beep The limit beeper is independent of the warning beeper and the operation complete beeper both of which are described in the Beeper Menu O QFF Turns the limit beeper off LH PASS Turns the limit passes beeper on When limit testing is on and the pass beeper is oN a beep is emitted each time a limit test is performed and a pass is detected O FAIL Turns the limit fails beeper on When li
47. 26007002 Figure 7 2 Softkey Menus Accessed from the Marker Key Marker Block 7 3 Marker Menu Marker sus MKR SUB MKR CLEAR SUB MKR SUB MKR PRESET MKRS MKR ON DATA MKR UNCOUPLE MKR CONT AMODE MENU Delta Marker Menu Figure 7 3 Marker Menu SUB MKR Displays the following softkeys which are used to turn on sub markers o SUB MKR 1 2 3 4 5 6 7 These keys put a sub marker at the present marker position CLEAR SUB MKR Displays the following softkeys which are used to turn off sub markers oO SUB MKR 1 2 3 4 5 6 7 These keys turn a sub marker OFF m PRESET MKRS Turns off all markers and cancels all settings of the marker functions MKR ON Selects a trace from data or memory to be applied for the marker values This softkey does not appear if the user trace display is turned on DATA Shows that the data trace is selected MEMORY Shows that the memory trace is selected m MKR COUPLE MKR UNCDUPLE Toggles between the coupled and uncoupled marker mode This softkey does not appear if the user trace display is turned on MKR COUPLE Couples the marker stimulus values for the two display channels Even if the stimulus is uncoupled and two sets of stimulus values are shown the markers track the same stimulus values on each channel as long as they are within the displayed stimulus range MKR UNCOUPLE Allo
48. 5 Built in Flopy Disk Drive 6 LINE Switch 4 Test Station Connectors CE002001 Figure 2 1 Analyzer Front Panel Front and Rear Panel Test Station and Test Heads 2 1 1 Front Panel Keys and Softkeys Some of the front panel keys change instrument functions directly and others provide access to additional functions available in softkey menus Softkey menus are lists of up to eight related functions that can be displayed in the softkey label area at the right hand side of the display The eight keys to the right of the LCD are the softkeys Pressing one of the softkeys selects the adjacent menu function This either executes the labeled function and makes it the active function causes instrument status information to be displayed or presents another softkey menu Some of the analyzer s menus are accessed directly from front panel keys and some from other menus For example the sweep menu accessed by pressing the Sweep key presents all the sweep functions such as sweep type number of points and sweep time Pressing NUMBER of POINTS allows the required number of points displayed per sweep to be entered directly from the number pad RETURN softkeys return to previous menus DONE indicates completion of a specific procedure and then returns to an earlier menu Usually when a menu changes the present active function is cleared Softkeys that are Joined by Vertical Lines When several possible choices are available fo
49. Complex Complex 2byte 4byte 16 X NOPlbyte Abyte 2byte Abyte 16 X NOP byte Abyte NOP Internal Use Data for each Measurement ol Internal NOP Internal Use Data for each Measurement Point Internal Figure 8 30 CAL Data Group Structure Number Of Points NOP is a two byte INTEGER value This number is equal to the number of complex data that follows the NOP DATA SEGMENT is a set of the values for each measurement point The values are IEEE 754 double precision floating number The values are two numbers the first value is the real part the second value is the imaginary part The data size in bytes can be determined by 16x NOP Instrument State Block 8 53 Saving and Recalling 8 54 m MEMORY consists of a header and a data segment by a channel m MEMORY TRACE consists of a header and a data segment by a channel Data Group Hea Data Segment trace 1 trace 2 trace n B NOP Integer Number of Trace Integer Interna Only Data for Each Data for Each Measurement Point Measurement Point Complex Complex internal Use Only 2byte C6008009 2byte Aby 16 x NOP bye 16 x NOP byte Figure 8 31 MEMORY and MEMORY TRACE Data Group Structure Instrument State Block Number Of Points NOP of a memory trace is a two byte INTEGER value DATA SEGMENT is a set of the values for each measurement point
50. Cp Cs 1x10 to 1x 10 1 mF 1 mF Lp Ls 1x10 to 1x 10 10H 10H 0 1x10 to 1x10 180 180 D 1x10 to 1x10 1 1 Q 1x10 to 1x10 lk lk Scale bottom value linear scale IZ R Rp Rs X 500x 10 to 500x 106 00 00 Y G B 500x 10 to 500x 106 08 08 I Tx Ty 500x 10 to 500x 106 1 1 Cp Cs 500x 10 to 500x 106 OF OF Lp Ls 500x 10 to 500x 106 0H 0H 0 500x 10 to 500x 106 180 180 D 500x 10 to 500x 106 0 0 Q 500x 10 to 500x 106 0 0 Scale Div IZ R Rp Rs X 1x 10715 to 100x 10 100 kQ 100 kQ Y G B 1x10715 to 100x 10 100 ms 100 ms I Tx Ty 1x10715 to 100x 10 0 2 0 2 Cp Cs 1x10715 to 100x 10 100 uF 100 uF Lp Ls 1x10715 to 100x 10 1H 1H 0 1x 10719 to 100x 10 36 36 D 1x10 15 to 100x106 0 1 0 1 Q 1x10 15 to 100x106 100 100 B 4 Input Range and Default Setting Scale Ref Function Range Preset Value Power ON Factory default Setting Reference value IZ R Rp Rs X 500x 10 to 500x 106 500 kQ 500 kQ Y G B 500x 10 to 500x 108 500 ms 500 ms P P Ty 500x 10 to 500x 108 0 0 Cp Cs 500x 10 to 500x 106 500 uF 500 uF Lp Ls 500x 10 to 500x 106 5H 5H 0 500x 10 to 500x 106 09 09 D 500x 10 to 500x 106 0 5 0 5 Q 500x 10 to 500x 106 500 500 Scale top value logarithm scale IZ R Rp Rs X 1x1
51. Lo el 2 i Le b gt ALF fnr CENTER Frequency of Stimulus At AMaker OFF Figure 7 13 Bandwidth Search Example At Tracking AMaker ALFA ALF ARF CENTER Frequency of Stimulus Width Value The width search function provides four ways to specify width value as follows ARF Fixed AMaker Stimulus Value At Fixed AMaker Marker Block 7 23 Marker Function 7 24 Marker Block Enter the width value directory Set a value that is the marker value divided by the square root of 2 Set a value which is the marker value multiplied by the square root of 2 Set a value which is the marker value divided by 2 When Amode is oN the width value is relative to the Amarker Width Value Width Value AMarker OFF AMarker ON MERVAL C 2 The active marker value The Amarker value divided divided by the square root by the square root of 2 of 2 MKRVAL 2 The active marker value The Amarker value multiplied by the square multiplied by the square root of 2 root of 2 MKRVAL 2 The active marker value The Amarker value divided divided by 2 by 2 FIXED Absolute width value Relative value to Amarker How to determine the quality factor Q of resonators To determine the Q value using the anti resonance point 1 2 Press to make the marker active Press SEARCH TRK on OFF to change it to SEARCH TRK ON off Then press S
52. Measurement Block 5 55 5 56 Measurement Block m FIXTURE COMPEN Displays the Fixture Compensation menu which is used to perform the fixture compensation measurements in order to reduce measurement errors existing along the test fixture m CAL KIT Leads to the Cal Kit menu that selects the default calibration kit and a user kit This in turn displays additional softkeys used to define calibration standards other than those in the default kits When a calibration kit has been specified its label is displayed in brackets in the softkey label m COMPEN KIT Leads to the Compen Kit menu that is used to define user define OPEN SHORT and LOAD for fixture compensation measurements When a set of user defined OPEN SHORT and LOAD values has been specified its label is displayed in brackets in the softkey label m PORT EXTENSIONS Leads to the Port Extension menu which is used to extend the apparent location of the measurement reference plane FIXED Cal and Compensation Points When FIXED is selected for the calibration measurement points using CAL POINTS the analyzer measures the standards on the following 178 frequency points The analyzer also measures the OPEN SHORT and LOAD compensation measurement points for the fixture compensation at the same frequency points unit MHz 1 1 03 1 06 1 09 1 12 1 15 1 18 1 21 1 24 1 26 1 29 1 32 1 35 1 38 1 41 1 44 1 47 1 5 1 55 1 6 1 65 1 7 1 75 1 8 1 85 1 9 1 95 2
53. OSC level must be same as level at which calibration is done OSC level is less than or equal to 0 25 Vrms or greater than 0 25 Vims and frequency range is within 1 MHz to 1 GHz m Environment temperature of the main frame is within 45 C of temperature at which calibration is done and within 0 C to 40 C A Er Accuracy Em Same as accuracy at which a normal test head Erm is used Loss Tangent Accuracy of Atan Same as accuracy at which a normal test head is used At the following frequency points instrument spurious characteristics could occasionally cause measurement errors to exceed specified value because of instrument spurious characteristics 10 71 MHz 17 24 MHz 21 42 MHz 42 84 MHz 514 645 MHz 686 19333 MHz 1029 29 MHz 1327 38666 MHz See EMC under Others in General Characteristics The excessive vibration and shock could occasionally cause measurement errors to exceed specified value 4291B RF Impedance Material Analyzer Technical Data 12 39 Material Measurement Accuracy with High Temperature Test Head Typical Effects of Temperature Drift on Dielectric Material Measurement Accuracy When environment temperature is without 5 of temperature at which calibration is done add the following measurement error Ac ey Accuracy SEP isses E Eas Ers 96 Eas E Loss Tangent Accuracy of 2 Atan Etan
54. Option 002 Material Measurement E w o LL Ko c 10M 100M Frequency Hz CE001223 Figure 12 30 Typical Permeability loss Tangent tan Measurement Accuracy QF 10 F hinz Note a This graph shows only frequency dependence of E to simplify it The typical accuracy of tan is defined as E Ej refer to Supplemental Characteristics for Option 002 Material Measurement 4291B RF Impedance Material Analyzer Technical Data 12 35 Option 002 Material Measurement 5 10 100M Frequency Hz CE001224 Figure 12 31 Typical Permeability Measurement Accuracy ur v s Frequency F 0 5 10M 100M Frequency Hz CE001225 Figure 12 32 Typical Permeability Measurement Accuracy ur v s Frequency F 3 F hing 12 36 4291B RF Impedance Material Analyzer Technical Data Option 002 Material Measurement 180M Frequency Hz CE001226 Figure 12 33 Typical Permeability Measurement Accuracy ur v s Frequency QF 10 F h In 4291B RF Impedance Material Analyzer Technical Data 12 37 Option 002 Material Measurement Applicable MUT Material Under Test Size Maximum DC Bias Voltage Current Using with 16453A ssssssssssssse ee y Using with 16454A ssssssssse ee y Operating Temperature Using with 16453A or 16454A Operating Humidity wet bulb te
55. P O Box 999 1180 AZ Amstelveen The Netherlands tel 31 20 547 9999 Japan Agilent Technologies Japan Ltd Call Center 9 1 Takakura Cho Hachioji Shi Tokyo 192 8510 Japan tel 81 426 56 7832 fax 81 426 56 7840 Latin America Agilent Technologies Latin American Region Headquarters 5200 Blue Lagoon Drive Suite 4950 Miami Florida 33126 U S A tel 305 267 4245 fax 305 267 4286 Australia New Zealand Agilent Technologies Australia Pty Ltd 347 Burwood Highway Forest Hill Victoria 3131 tel 1 800 629 485 Australia
56. Raw Data Raw Real Raw Imag Raw data arrays Calibration Data Cal i 1 Real Cal i 1 Imag Cal coefficient 11 Cal 1 2 Real Cal 1 2 Imag Cal coefficient 12 Cal 1 3 Real Cal 1 3 Imag Cal coefficient 13 Cal 2 1 Real Cal 2 1 Imag Cal coefficient 21 Cal 2 2 Real Cal 2 2 Imag Cal coefficient 22 Cal 2 3 Real Cal 2 3 Imag Cal coefficient 23 Cal 3 1 Real Cal 3 1 Imag Cal coefficient 31 Cal 3 2 Real Cal 3 2 Imag Cal coefficient 32 Cal 3 3 Real Cal 3 3 Imag Cal coefficient 33 Data Data Real Data Imag Corrected Data arrays Memory Memory Real Memory Imag Corrected Memory arrays Data Trace Meas Prmtr Data Data Trace arrays Memory Trace Meas Prmtr Memory Memory Trace arrays 8 58 Instrument State Block Analyzer Features Introduction System Overview This chapter provides additional information on analyzer features The following subjects are covered in this chapter m System Overview m Data Processing Flow Impedance analyzers usually apply a stimulus signal to the DUT The analyzer then measures the complex voltage value which is applied between the terminals of the DUT and the complex current which is flowing through the DUT The impedance value is derived from both the voltage and current values Figure 9 1 is a simplified block diagram of the analyzer A detailed block diagram of the analyzer is provided in the Service Manual together with a complete theory of system operation
57. The PRINT COLOR command does NOT work with a black and white printer PRNT COLOR FIXED Toggles the printing color between FIXED and VARIABLE If FIXED is selected the analyzer prints a hard copy with default colors If VARIABLE is selected the analyzer prints a hard copy with colors as similar as possible to the display colors that can be adjusted See Display in Chapter 5 for display colors adjustment CE008041 Figure 8 14 Print Setup Menu Because of the limited number of printer ink colors the printed color is not always the same as the displayed color m DPI Specifies the resolution of a printer used for printing by dpi The range of settable resolution is between 75 and 600 dpi wm TOP MARGIN Specifies the top margin of printing by inch The settable margin range is between 0 and 5 inches in step of 0 1 inch m LEFT MARGIN Specifies the left margin of printing by inch The settable margin range is between 0 and 5 inches in step of 0 1 inch m DEFAULT SETUP Resets the printing parameters to the following default settings 8 26 Instrument State Block Cony e Printing resolution 75 dpi e Form feed ON e Sheet orientation Portraint e Softkey label printing OFF e Top margin 1 0 inch e Left margin 1 0 inch Instrument State Block 8 27 Copy Limit Test Menu MORE LIMIT TEST TABLE DISPLAY LIST DISP MODE UPR amp LWR MID amp DLT RET
58. The values are IEEE 754 double precision floating number The values are two numbers the first value is the real part the second value is the imaginary part Saving and Recalling m User Trace consists of a header and 8 data segments that include user trace X array and Y array Header User Trace 1 User Trace 2 User Trace 3 User Trace 4 ao Internal NOPI NOP2 NOP3 NOP4 Internal X array for Y array for Internal X array for Y array for Internal X array for Y array for Internal X amay for Y array for Internal Use Only Use Only User Trace User Trace 1 Use Only User Trace ZUser Trace 2 Use Only User Trace 3User Trace 3 Use Only User Trace 4User Trace 4 Use Only Ebyte 2byte 2byte 2byte Zbyte dbyte amp xNOPIbyte amp xNOP byte Abyte amp xNOPibyte ExNOP byte dbyte xNOP byte exNOP byte Abyte BxNOPibyte ExNOP Ibyte Abyte NOP for User Trace No 1 NOP for User Trace No 2 NOP for User Trace No 3 NOP for User Trace No 4 06008007 Figure 8 32 User Trace Data Group Structure m Number Of Points NOP is a two byte integer value m The values of an X array and Y arrays are IEEE 754 double precision floating numbers 8 byte length The data size in bytes for the X array of each user trace can be determined by 8xNOP n is the User Trace number Instrument State Block 8 55 Saving and Recalling File Structure of Internal D
59. Trigger 1 5 6 12 trigger event 6 13 trigger input 2 10 trigger signal polarity 6 13 typical 12 1 typically 12 1 upgrade kit 10 2 user defined cal points 5 55 user defined compensation points 5 57 user kit 5 64 user trace 5 47 user trace format 5 31 user trace scale 5 51 EE utility menu 7 18 Vl 2 7 video port 2 10 video signal 2 10 warm up time 12 1 width function 7 16 width search 7 22 width value 2 5 X 11 3 Y 11 4 Y 11 4 Z 11 3 7 11 3 ZOOMING APERTURE 7 9 Index 13 REGIONAL SALES AND SUPPORT OFFICES For more information about Agilent Technologies test and measurement products applications services and for a current sales office listing visit our web site http www agilent com find tmdir You can also contact one of the following centers and ask for a test and measurement sales representative 11 29 99 United States fax 61 3 9272 0749 Agilent Technologies tel 0 800 738 378 New Zealand Test and Measurement Call Center fax 64 4 802 6881 P O Box 4026 Englewood CO 80155 4026 Asia Pacific tel 1 800 452 4844 Agilent Technologies 24 F Cityplaza One 1111 King s Road Canada Taikoo Shing Hong Kong Agilent Technologies Canada Inc tel 852 3197 7777 5150 Spectrum Way fax 852 2506 9284 Mississauga Ontario L4W 5GI tel 1 877 894 4414 Europe Agilent Technologies Test amp Measurement European Marketing Organization
60. Zi 50 9 jZin tan At 11 34 Where At is port extension in time sec at L co When the linear portion of the DUT s phase is removed using the port extension function the electrical length of the DUT can be read in the active entry area of the display Setting Proper Electrical Length Compensation You can easily check to determine whether the electrical length can fit the extended measurement circuit Proceed as follows 1 Perform calibration without using an extension cable Connect the extension cable or the unknown fixture to the test port Set the measurement parameter to I 2 3 4 Set the measurement format to Smith chart format 5 Set the Smith polar marker to Logmag Phase 6 Connect a 0 S termination at the tip of the extension cable or an open at the tip of the extension cable 1 Turn the port extension on 8 Change the port extension value until the 0 values measured are 0 at any frequency point Impedance Measurement Basics 11 17 Port Extension 11 18 Another Method of Canceling the Measurement Error Caused by Extension Cable Impedance Measurement Basics The OPEN SHORT LOAD fixture compensation cancels the error caused by port extension To cancel the error 1 Perform calibration at the tip of APC 7 on the test head without using an extension cable 2 Connect the extension cable and the test fixture to be used 3 Perform
61. and Current Figure 11 21 shows the schematic fixture structure of the 16454A Figure 11 21 Schematic Fixture Structure of 16454A Impedance Measurement Basics 11 29 Permeability Measurements The 16454A measures core shape magnetic material as shown in Figure 11 21 Erasing B and and considering the physical shape and dimensions of the 164544 the self inductance of the measurement circuit including MUT is derived as follows L p Bas d pho Ju E 11 J By dr dz 80 Lo C J r Dhl hol 11 81 Ee Oi Dhin holn 11 81 Modify equation 11 87 to get the relative permeability uy of MUT 2m L Los r 1 11 82 Mr Where Lg is the self inductance of the fixture when it is empty b Les hon 11 83 27 a F is the shape function of MUT which is decided by its dimensions only F hs 11 84 Complex Permeability When the magnetic field generated by an ac current is flowing is applied to the magnetic material the permeability is defined by the complex value shown in equation 11 92 r u ju 11 85 Now because the inductor has a loss factor the inductance in equations 11 87 through 1 89 must be modified to a complex impedance which includes the loss L f 11 86 Z Rs jwLs Rs J fir ue jT b Ceoti26 Figure 11 22 Material Has Loss The complex relative permeability of the MUT can then be determined by the
62. and so on stored in the Al CPU s EEPROM are invalid See the Service Manual for troubleshooting EEPROM WRITE ERROR Data cannot be stored properly into the EEPROM on the A1 CPU when performing the display background adjustment or updating correction constants in the EEPROM using the adjustment program See the Service Manual for troubleshooting Execution error This is the generic syntax error that the analyzer cannot detect more specific errors This code indicates only that an execution error as defined in IEEE 488 2 11 5 1 1 5 has occurred Exponent too large The magnitude of the exponent was larger than 32000 see IEEE 488 2 7 7 2 4 1 F BUS TIMER CHIP TEST FAILED An internal test 1 Al CPU fails The Al CPU s F BUS Frequency Bus timer does not work properly Replace the Al CPU with a new one See the Service Manual for troubleshooting 208 257 256 230 220 95 Temperature Coefficient Measurement FAILURE FOUND FROM A D MUX TO A D CONVERTER An internal test 5 A6 A D CONVERTER fails A trouble is found on the signal path from the A D multiplexer to A D converter on the A6 receiver IF See the Service Manual for troubleshooting FAN POWER OUT OF SPEC An internal test 4 A2 POST REGULATOR fails The voltage of the fan power supply at the DC bus node 11 is out of its limits See the Service Manual for troubleshooting FDC CHIP TEST FAILED An internal test 1 Al CPU fails
63. the segment traces are connected by a straight line m Order base The X axis is linearly scaled by the number of sweep points according to the sweep list The following figures show an example of the difference between these modes This measurement has two segments one is resonance frequency and another is anti resonance frequency The span of the lower segment is narrower than the span of the higher segment If the trace of this list is displayed on the frequency base scale the sweep points of interest cannot be displayed visibly as shown in the left graph below The order base can display this trace as shown in the right graph cH zi Tse 5 keo m cH zi Tse 5 keo m GSC LIST BIAS OFF GSC LIST BIAS OFF START 2 MHz stop 700 MHz START 2 MHz stop 700 MHz Frequency Base Order Base Segment Menu SEGMENT Sweep MKR START MKR STOP NUMBER of POINTS OSC LEVEL POINT AVG FACTOR MORE SEGMENT QUIET SEGMENT DONE SEGMENT STOP CENTER SPAN RETURN CE006004 Figure 6 6 Segment Menu SEGMENT MKR START Sets the stimulus start value to the stimulus value
64. value for perfect OPEN standard equals to perfect OPEN value These conditions are explained as follows Assuming that A D symmetric circuit 11 44 C 0 11 45 Then the compensation coefficients are Fixture Compensation Acompen 1 jO 11 46 Beompen Zam Zs 11 47 Ccompen O jO 11 48 Where Zsm is the impedance of the value measured for shorted device Zas is the impedance value defined as SHORT for the fixture compensation kit LOAD Compensation When only the LOAD compensation is used for the fixture compensation two additional conditions are required to solve the Z equation One condition assumes that the value measuring shorted device is the same as the value defined as SHORT for the fixture compensation kit The other condition assumes that SHORT measurement capability is ideal and OPEN measurement capability is ideal These conditions are explained as follows Assuming that B 0 11 49 C 0 11 50 Then the compensation coefficients are Acompen je 11 51 Beompen O jO 11 52 Ceompen 0 jO 11 53 Where Zim is the impedance value measured for load device Zi is the impedance value defined as LOAD of the fixture compensation kit OPEN SHORT Compensation When OPEN and SHORT compensations are used for the fixture compensation one additional condition is required to solve the Z equation This condition is explained as follows Assuming that A D symmetric circ
65. 0 2 1 2 2 2 3 2 4 2 5 2 6 2 8 3 0 3 2 3 4 3 6 3 8 4 0 4 3 4 6 5 0 5 5 6 0 6 5 7 0 7 5 8 9 10 11 12 13 14 15 16 18 20 22 24 26 28 30 33 36 39 42 45 48 51 55 60 65 70 75 80 85 90 95 100 110 120 130 140 150 160 170 180 190 200 220 240 260 280 300 320 340 360 380 400 420 440 460 480 500 520 540 560 580 600 620 640 660 680 700 720 740 760 780 800 820 840 860 880 900 920 940 960 980 1000 1020 1040 1060 1080 1100 1120 1140 1160 1180 1200 1220 1240 1260 1280 1300 1320 1340 1360 1380 1400 1420 1440 1460 1480 1500 1520 1540 1560 1580 1600 1620 1640 1660 1680 1700 1720 1740 1760 1780 1800 FIXED Compensation Pointsd require FIXED CAL Points When the compensation measurements are performed at the FIXED points the calibration measurements must have been performed at the FIXED Cal Points If the calibration was performed at the USER points the compensation measurements must be performed at the USER points Fixture Compensation Menu for Impedance Measurement COMBEN E MENU FIXTURE COMPEN SHORT LOAD OPEN COMP POINT FIXED DONE COMPEN RESUME COMP SEQ OPEN on OFF SHORT on OFF LOAD on OFF RETURN Figure 5 43 Fixture Compensation Menu m COMPEN MENU Leads to the following softkeys which are used to perform a fixture compensation measurement OU OPEN Measures OPEN for the fixture compensation SHORT Measures SHORT standard for the fixture
66. 1997 A1 EN 61326 1 1997 A1 CISPR 11 1990 EN 55011 1991 AS NZS 2064 1 Group 1 Class A IEC 61000 4 2 1995 EN 61000 4 2 1995 4 kV CD 8 kV AD IEC 61000 4 3 1995 EN 61000 4 3 1996 3 Vim 80 AM 27 1000 MHz IEC 61000 4 4 1995 EN 61000 4 4 1995 1 kV power line 0 5 kV Signal line IEC 61000 4 5 1995 EN 61000 4 5 1995 0 5 kV line line 1 kV line earth IEC 61000 4 6 1996 EN 61000 4 6 1996 3 V 80 AM power line EC 61000 4 11 1994 EN 61000 4 11 1994 100 1cycle European Council Directive 73 23 EEC and carries the CE marking accordingly IEC 61010 1 1990 A1 A2 EN 61010 1 1993 A2 CAN CSA C22 2 No 1010 1 92 Additional Information LEDs in this product are Class 1 in accordance with EN 60825 1 1994 I The product was tested in a typical configuration Dec 15 1999 Date Yukihiko Ota Quality Engineering Manager For further information please contact your local Agilent Technologies sales office agent or distributor Agilent 4291B RF Impedance Material Analyzer Operation Manual RE Agilent Technologies Agilent Part No 04291 90040 Printed in Japan September 2002 Fifth Edition Notice The information contained in this document is subject to change without notice This document contains proprietary information that is protected by copyright All rights are reserved No part of this document may be photocopied reproduced or translated to another language without the prior written
67. 240 001 x furia 2x10 5 2x10 7 x frre Vosc lt 0 02 V 222 x 0 1 5x 10 xf 01117 To x 2x 107 1x 10 x franz Nay gt 8 4 5 7 0 02 V lt Vose lt 0 12 V 0 1 5x 10 x frr 2x1079 1x 107 xfrygz Zx 25009 0 1 5x 10 x frr 2x10 1x 107 xfrygz 0 12 V Vose Zx 500 Q 0 1 5x 10 x frr 7x1079 1x 1077 x fpr Table 12 2 Z and Y when Low Impedance Test Head is used Measurement Conditions Number of Meas Zs 9 Yo 5 Point OSC Signal Level Impedance Averaging Vosc Zx Nav Vosc lt 0 02 V 222 x 0 1 0 001x ftr To x 1x107 2x 10 x franz 1 lt Nav lt 7 E gt 1 0 02 V Vose lt 0 12 V 0 1 0 001 x fryrrz 1x1075 4 2x 1077 x frp Ix lt 5 Q 0 01 0 001 x frr 1x1075 4 2x 1077 x frp 0 12 V lt Vosc Zx gt 5 2 0 05 0 001 xffMHz 1x104 4 2x 1077 x frp Vosc lt 0 02 V 202 x 0 05 5x 10 x firey PEZ x 8x 10 1x 10 x franz Nay gt 8 T 4 5 7 0 02 V lt Vose lt 0 12 V 0 05 5x 10 x frr 3x107 1x 1077 xfruHz Ix lt 5 Q 0 01 5x10 x frr 3x107 1x 1077 xfruHz 0 12 V lt Vosc Zx gt 5 2 0 02 5x 107 x frr 3x107 1x 1077 xfruHz At the following frequency points instrument spurious characteristics could occasionally cause measurement errors to exceed specified value because of instrument spurious characteristics 10 71 MHz 17 24 MHz 21 42 MHz 4
68. 3 Sweep Menu 4e 6 4 List Menu l4 6 1 Segment Menu 0 4 6 9 Source MEL 6 10 Source Menu o or A we eee 06 10 Trigger o a 6 12 Trigger Menu o 6 12 S tart S top Center Span 3 NE ej 6 14 7 Marker Block Marker e e 1 3 Marker Menu MM MM 7 4 Delta mode menu 44 7 6 Marker MM e 7 7 Marker menu ee ee ee 7 7 Search 2 6 s o 710 Search Menu 2 ee 7 11 Target Menu 0 2 1 2 Peak Menu 2 lle 2 713 Search Range Menu Ce 7 15 Widths Menu 484 2 T1416 Utility MM 2 7 18 Utility Menu MM 1 18 Marker Function l l ll en 1 20 Three Types of Markers 0 7 20 Marker Value n 1 20 X axis Value to be Displayed 1 20 Stimulus Value len 1 20 Time 522454 7 20 Relaxation Time 1 27f 7 20 Marker Level Monitor 0 02 7 21 OSC level monitor value 7 21 Continuous Discrete Mode 0 7 21 Marker on the Data Trace or on the Memory Trace 7 21 AMode lll 4 4 4A 7 21 Marker Search Function 0 7 22 Width Function l l les 7 22 Width Value 2 2 2 2 5 5 2 7 23 Peak Definition 2 0 een 7 26 Peak Definition lll len 1 26 8 Instrument State Block System NM SL MN
69. 3 8 4 8 5 8 6 8 7 8 8 8 9 8 10 8 11 8 12 8 13 8 14 8 15 8 16 8 17 8 18 8 19 8 20 8 21 8 22 8 23 8 24 8 25 8 26 8 27 8 28 8 29 8 30 8 31 8 32 9 1 9 2 11 1 11 2 11 3 11 4 11 5 11 6 11 7 11 8 11 9 Marker Menu l l ee ees Softkey Menus Accessed from the Key Search Menu 2222 lll ln Target Menu 4 llle Peak Menu 2 ls Search Range Menu 2 2 0 240 Widths Menu l l les Utility Menu 2 cll hs Bandwidth Search Example Q Measurement Examples s s Peak Definition cll 084 Instrument State Block Softkey Menus Accessed from the Key System Menu lh Instrument BASIC Menu Peogram Menu lll lle Memory Partition Menu a Clock Menu 2 2 2 2 2 252 2 5 Beeper Menu a a lll en Limit Test Menu Limit Line Entry Menu Local Menu 2 2 2 2 Softkey Menus Accessed from the Key Copy Menu l l ln Print Setup Menu a len Copy Limit Test Menu lll Copy List Sweep Menu Screen Menu a ee n Softkey Menus Accessed from the Keys Save Menu 2 2 ll sh Define Save Data Menu Re Save File Menu 0 8484 Purge File Menu
70. 3 V m according to IEC 1000 4 3 1995 the measurement accuracy will be within specifications over the full immunity test frequency range of 27 to 1000 MHz except when the analyzer frequency is identical to the transmitted interference signal test frequency This ISM device complies with Canadian ICES 001 Cet appareil ISM est conforme la norme NMB 001 du Canada Safety Complies with IEC 1010 1 1990 Amendment1 1992 and Amendment2 1995 Complies with CSA C22 2 No 1010 1 92 Power requirements 90V to 132V or 198V to 264V automatically switched 47 to 63 Hz 300VA max Weight Mainframe ssssssssss I 21 5 kg SPC Test Station sssssssssssssssssses se 3 7 kg Dimensions Mainframe 425 W x 235 H x 553 D mm Test Station 02000 275 W x 95 H x 205 D mm 4291B RF Impedance Material Analyzer Technical Data 12 21 Option 013 and 014 High Temperature Test Heads External program Run Cont input Connector sss ee BNC female Level ssssssesssse e anoen TTL Keyboard connector s sese mini DIN I O port 4 bit in 8 bit out port TTL Level I O port pin assignments Figure 12 15 I O Port Pin Assignment Specifications for Option 1D5 High Stability Frequency Reference Reference Oven Output Frequency ssssssse sss ene 10 MHz nominal Level
71. 4e 12 16 Operation Conditions of the Test Head 12 18 Dimensions of High Temperature Test Head 12 18 Display 2 2 2 2 2 2 2 2 5 2 5 2 12 19 Data Storage 12 19 BEBA 12 19 Printer parallel port 12 20 General Characteristics lll 12 20 Input and Output Characteristics 12 20 Operation Conditions 12 21 Non operation conditions c 12 21 Others 12 21 External program Run Cont input 12 22 B Specifications for Option 1D5 High Stability Frequency Reference Reference Oven Output 12 22 12 22 Supplemental Characteristics for Option 002 Material Measurement e Measurement Frequency Range Measurement Parameter Permittivity parameters Permeability parameters Typical Measurement Accuracy 12 23 12 23 12 23 12 23 12 23 12 23 Option 002 Material Measurement Accuracy with Option 013 and 014 High Temperature Test Head Typical Dielectric Material Measurement Accuracy with High Temperature Test Head Typical o Typical Effects of Temperature Drift on Dielectric Material Measurement Accuracy Magnetic Material Measurement Accuracy with High Temperature Test Head Typical o Typical Effects of Temperature Drift on Magnetic Material Measurement Accuracy Furnished Accessories Manual Changes Introduction Manual Changes Serial Number nput Range and Default t
72. 55 C to 200 C 4291A Test Station 600 High Temperature Test Head 150 High Temperature Stand UNIT mm C6600042 Figure 12 13 Dimensions of High Temperature Test Head 12 18 4291B RF Impedance Material Analyzer Technical Data Display Data Storage GPIB Option 013 and 014 High Temperature Test Heads LCD type size ooo Color TFT 8 4 inch Resolution ss ee 640 x 480 Effective Display Area 160 mm x 115mm 600 x 430 dots Number of display channels esses 2 Format single dual split or overwrite graphic and tabular Number of traces For measurement 0 0 00 ooo 1 trace channel For memory sesesssssn 16 traces channel maximum Data math functions gain x data offset gain x memory offset gain x data memory offset gain x data memory offset gain x data memory offset gain x dataxmemory offset Marker Number of markers Main marker 0 000 c cece eens 1 for each channel Sub marker 1 0 00 00 ccc ccc cnet ee 7 for each channel AMarker 0 0 ees 1 for each channel Type co floppy disk drive Volatile memory disk Capacity floppy disk eee 720 kB 1 44 MB Volatile memory disk can be backed up by flash memory 448 kB maximum Disk format sss LIF DOS
73. 65 OPEN SHORT LOAD Compensation When OPEN SHORT and LOAD compensations used for the fixture compensation no more conditions are required to solve the Z equation The compensation coefficients are Acompen Yom Zsm Zim YosZssZls 1 Zim Yom Zis 1 YomZsm Zss Zsm Zim 1 Zim Yom Zsm YosZss t 1 YomZsm ZimZ1s Yos 11 66 Beompen Zsm Zim YosZssZls Zsm 1 Zim Yom Zis Zim l YomZsm Zss Yom Zsm Zim YosZss4Zls 1 Zim Yom as t 1 Yom Zsm Zss 11 67 Fixture Compensation Ccompen Yom Zsm Zim 1 Zim Yom YosZss 1 Yon Zsm Zis Yos Zsm Zim 1 Zim Yom Zsm YosZss 1 Yom4Zsm ZimZis Yos 11 68 Impedance Measurement Basics 11 25 Permittivity Measurements Permittivity Measurements conos Figure 11 17 Schematic Electrode Structure of the 16453A In general when a dielectric material is put in a pair of parallel flat electrodes capacitance C is calculated using the following equation C coer 11 69 Complex Permittivity Strictly speaking when ac voltage is applied to the dielectric material the material has some loss and permittivity e is defined as the following complex value En el jen 11 70 Now the capacitor has a loss factor and the capacitance C in equation 11 76 can be modified to the complex admittance Y as follows or 11 71 ju Y je d 11 72
74. 80 19 47 48 NOT ALLOWED IN FREQUENCY SWEEP SWEEP DIR SOURce 1 2 SWEep DIRection DOWN is pressed in frequency sweep Sweep direction down is only available for OSC level sweep DC V or DC I sweep NOT ALLOWED IN SVC MODE Dual channel cannot be displayed in the service mode NOT AVAILABLE FOR THIS FIXTURE GPIB only You cannot execute CALCulate MATH1 EXPRession NAME DCO PER when the SYSTem FIXTure NONE 16191 16192 16193 16194 is selected NOT AVAILABLE FOR THIS FORMAT For the permittivity and permeability measurement You cannot execute POLAR CHART SMITH CHART and ADMITTANCE CHART DISPlay WINDow TRACe1 GRATicule FORMat POLar SMITh ADMittance NOT ENOUGH DATA GPIB only The amount of data sent to the analyzer is less than that expected when the data transfer format is binary Numeric data error This error as well as errors 121 through 129 are generated when parsing a data element that appears to be numeric including the nondecimal numeric types This particular error message is used if the analyzer cannot detect a more specific error Numeric data not allowed A legal numeric data element was received but the analyzer does not accept it in this position for a header ON POINT NOT ALLOWED FOR THE CURRENT TRIG The trigger event mode cannot be changed to the ON POINT mode because the current trigger source setting does not allow the ON POINT mode The trigger event ON
75. BNC female Positive Trigger Signal Negative Trigger signal Figure 12 14 Trigger Signal External monitor output Connector coco D sub 15 pin HD Display resolution sssuse 640 x 480 VGA 12 20 4291B RF Impedance Material Analyzer Technical Data Operation Conditions Non operation conditions Others Option 013 and 014 High Temperature Test Heads Temperature Disk drive non operating condition 0 C to 40 C Disk drive operating condition 10 C to 40 C Humidity wet bulb temperature lt 29 C without condensation Disk drive non operating condition 15 to 95 RH Disk drive operating condition 15 to 80 RH Altitude eee 0 to 2 000 meters Warm up time ss eee 30 minutes Temperature ooo 20 C to 60 C Humidity wet bulb temperature lt 45 C without condensation 15 to 95 RH Altitude ooo 0 to 4 572 meters EMC Complies with CISPR 11 1990 EN 55011 1991 Group 1 Class A Complies with IEC 1000 3 2 1995 EN 61000 3 2 1995 Complies with IEC 1000 3 3 1994 EN 61000 3 3 1995 Complies with IEC 1000 4 2 1995 EN 50082 1 1992 4 kV CD 8 kV AD Complies with IEC 1000 4 3 1995 EN 50082 1 1992 3 V m 27 1000 MHz Complies with IEC 1000 4 4 1995 EN 50082 1 1992 0 5 kV Signal Lines 1 kV Main Note When tested at
76. Bes le Where Ez is e accuracy when a normal test head is used E angs 15 loss tangent accuracy when a normal test head is used Eas is the effect of temperature drift on the accuracy as follows Eas T AT Eys is the hysterisis of the effect of temperature drift on the accuracy as follows _ TAT E b3 3 where T is temperature coefficient as follows Te Ki Ko K3 K 1x 107 x 50 300f 1 K 3x 10 5 x 4 4 sop m UA 10 f 1 Ks 5x 107 x 02 8 1 rm 10 CT ome 19 f Measurement Frequency GHz 13 fo GHz EM t Thickness of MUT mm rm measured value of e The illustrations of temperature coefficient Tc are shown in Figure 12 34 to Figure 12 36 AT is difference of temperature between measurement condition and calibration measurement condition as follows 12 40 4291B RF Impedance Material Analyzer Technical Data Material Measurement Accuracy with High Temperature Test Head AT T meas Teal Tmeas Temperature of Test Head at measurement condition Tear Temperature of Test Head at calibration measurement condition 4291B RF Impedance Material Analyzer Technical Data 12 41 Material Measurement Accuracy with High Temperature Test Head Frequency Hz Figure 12 34 Typical Frequency Characteristics of Temperature Coefficient of e and Loss Tangent Accuracy Thickness 0 3 mm 12 42 42
77. Block 5 5 Smith Polar Admittance or Complex Plance Format IMPEDANCE CZ ADMITTANCE Y REFL COEF CE FIXTURE NONE Complex Impedance Measurement Menu SELECT FIXTURE i FIXTURE NONE 16191 16192 16193 16194 USER RETURN SAVE USER FXTR KIT MODIFY NONE y NO OPTIONO02 OPTIONOO2 DEFINE EXTENSION LABEL FIXTURE KIT DONE MODIFIED RETURN CE005048 Softkey Menus Accessed from the Meas Key for Impedance Measurement when IMPEDANCE NONE PERMITTIVITY 16453 PERMEABLTY 16454 S SELECT FIXTURE SAVE USER FXTR KIT MODIFY NONE Y FIXTURE NONE 16191 16192 16193 16194 USER RETURN DEFINE EXTENSION LABEL FIXTURE KIT DONE MODIFIED RETURN Impedance Fixture Menu Figure 5 5 Smith Polar Admittance or Complex Plane Format is selected 5 6 Measurement Block Wess IMPEDANCE Z ADMITTANCE Y REFL COEF T PERMITTVTY IMPEDANCE amp NONE
78. Cp Cs Lp Ls Rp Rs D Q Chl u meas u tan 8 y u Z 02 R X Y pol u l y G B IE 0 Tx Ty Cp Cs Lp Ls Rp Rs D Q Ch2 meas tan amp y u IZ 02 R X Yl yl p y G B IE 0 Tx Ty Cp Cs Lp Ls Rp Rs D Q Test Fixture 16191A 16192A 16193A User None or No effect None None 16193A 16194A when either the 16193A or 16194A is selected User Fixture Definition Label No effect No effect empty Extension 10 meter to 10 meter No effect No effect 0 Thickness 0 to 3 mm No effect UNDEFINED Outer diameter No effect UNDEFINED Inner diameter No effect UNDEFINED 1 After setting material size m Function Range Preset Value Power ON Factory default Setting Format Linear Log Polar Smith Admittance Linear Linear Complex Expanded Phase ON OFF OFF OFF Phase Unit Degree Radian Degree Degree X axis Lin Log Linear Logarithm Linear Linear Y axis Lin Log Linear Logarithm Linear Linear B 2 Input Range and Default Setting bigis Function Range Preset Value Power ON Factory default Setting Dual Chan ON OFF ON ON Split Display ON OFF OFF OFF Define Trace Data Memory Data and Memory Data Data Select memory trace 1 to 16 Total NOP of memory 1 1 traces lt 801 x3 Data math Data Data Mem Data Mem Data Data Data Mem Gain 1x10 to 1x 10 1 1 Offset 1
79. Impedance Measurement Menu IMPEDANCE 2 ADMITTANCE 0 REFL Corr FIXTURE NONE D Impedance 4 Fixture Menu CE005053 Figure 5 9 Complex Impedance Measurement Menu This softkey menu can be accessed at the following conditions m Format the polar Smith admittance or complex plane format is selected m Fixture Impedance is selected m IMPEDANCE Z Measures complex impedance when the polar or complex plane format is selected This softkey is not available when Smith chart or admittance chart is selected m ADMITTANCE Y Measures complex admittance when the polar or complex plane format is selected This softkey is not available when Smith chart or admittance chart is selected m REFL COEF I Measures reflection coefficient when the Smith admittance polar or complex plane format is selected m DUAL PARAMETER This softkey is not available for Smith admittance polar chart and complex plane formats m FIXTURE Leads to the Fixture Menu which is used to select the test fixture used with the analyzer The selected test fixture is displayed in brackets in the softkey label m MATERIAL SIZE This softkey is not available when the fixture for impedance measurement is selected Measurement Block 5 11 Impedance Measurement Dual Parameter Menu DUAE PARAMETER
80. Interface eee IEEE 488 1 1987 IEC625 Interface function SH1 AHI T6 TEO L4 LEO SR1 RL1 PPO DC1 DTI C1 C2 C3 C4 C11 E2 Numeric Data Transfer formats ASCII 32 and 64 bit IEEE 754 Floating point format DOS PC format 32 bit IEEE with byte order reversed Protocol esses seen IEEE 488 2 1987 4291B RF Impedance Material Analyzer Technical Data 12 19 Option 013 and 014 High Temperature Test Heads Printer parallel port Interface IEEE 1284 Centronics standard compliant Printer control language HP PCL3 Printer Control Language Connector coo D sub 25 pin General Characteristics Input and Output Characteristics External reference input Frequency sssssss 10 MHz 100 Hz typically Level sse 6 dBm typically Input impedance ssssn 509 nominal Connector coco BNC female Internal Reference Output Frequency e sees IA 10 MHz nominal Level ess ene tne ees 2 dBm typically Output Impedance 50 9 nominal Connector ccoo BNC female External trigger input Level ss s I etn e es TTL Level Pulse width Tp ssess gt 2 ps typically Polarity sssss positive negative selective Connector ccoo
81. List sweep List sweep table edit Log sweep Manual trigger Measurement Restart Number of points OCS level sweep OSC level Single sweep Stimulus sweep range Sweep direction Sweep hold Trigger signal polarity User specified number of sweeps Gween riega Sweep Ere Ge riega Sweep Sweep Sweep Sweep riega riegos Sweep Sweep ono riega Gan E Center Span Sweep riega riega riegos Sweep Menu Trigger menu Sweep Menu Source Menu Sweep Menu Trigger menu Sweep Menu Sweep Menu List Menu and Edit Segment Menu Sweep Menu Trigger menu Trigger menu Test Head Selection Sweep Menu Source Menu Trigger menu Start Stop Center Span Sweep Menu Trigger menu Trigger menu Trigger menu For Additional Information on See All Softkey Trees GPIB Command Reference Instrument BASIC capability through the GPIB Preset values and Setting Range of each function setting value How to control the 4291B using an external controller or the HP Appendix B in this manual Appendix C in this manual GPIB Command Reference in the Programming Manual Programming Manual 6 2 Stimulus Block Gres SWEEP TIME AUTO POINT DELAY TIME SWEEP DELAY TIME NUMBER of POINTS COUPLED CH ON off SWEEP MENU Y SWP SRC OSC LEVEL
82. Low Loss air capacitor is measured in the calibration menu Although this is an approximate method just performing these procedures make the analyzer accurate enough to perform high Q measurements C6011012 Figure 11 12 Modifying the Standard Value of a 50 0 LOAD using a Low Loss Air Capacitor Low Loss Air Capacitor calibration does not affect the measurement below 300 MHz In fact taking frequency into consideration the analyzer uses the following equations for Zi Zip 50 e JkA8 Where kis a constant that depends on the measurement frequency Because the phase of 50 Q LOAD at a low frequency is regarded as zero the analyzer uses the following value as k m k O at frequency lt 300 MHz fi 300 k Ima ee at 300 MHz lt frequency lt 500 MHz 500 300 m k 1 at frequency gt 500 MHz Impedance Measurement Basics 11 15 Port Extension Port Extension When the extension cable is used to extend the measurement plane from APC 7 of the head to the tip of the cable the measurement error increases because of the additional impedance in a distributed element circuit of the cable To minimize the measurement errors the port extension function simulates a variable length lossless cable that can be added to or removed from the test port to compensate for interconnecting cables test fixtures etc The value of port extension is annotated in units of time with s
83. Measurement Impedance Measurement Menu Y pm OT PEDANCE ROMTINCE Lo MAGIZ MAG YD RE AGI CAPACIINCE RESISINCE PHASE PHASER PRECD PRLIRp BHASES RESISTIR GONGUSTGI en SERES SERIES REALES REACTOS SES A DEACTOR WERE MACE P 15 MOBE MORE SERES O FACTOR 3 5 WERE MG MORE 5 5 DUAL Dual Parameter Menu METER XTURE NONE Impedance Fixture Menu DUAL RAMETER FIXTURE NONE DUAL PARAMETER FIXTURE INONE DUAL RAMETER FIXTURE NONE DUAL PARAMETER FIXTURE NONE CE005007 Figure 5 8 Impedance Measurement Menu m IMPEDANCE MAGCIZI Measures absolute magnitude value of impedance Z m PHASE z Measures phase value of impedance 6 RESIST R Measures resistance value R Measurement Block 5 9 Impedance Measurement 5 10 Measurement Block m REACT X Measures reactance value X Cl ADMITTNCE MAGC Y Measures absolute magnitude value of admittance Y O PHASE y Measures phase value of admittance 6 E CONDUCT G Measu
84. Measurement Basics This chapter introduces the following basic concepts of impedance measurements m Impedance Parameters m Series and Parallel Circuit Models m Smith Chart m Calibration Concepts m Port Extension m Fixture Compensation m Permittivity Measurements m Permeability Measurements Impedance Measurement Basics 11 1 11 2 Impedance Measurement Basics Impedance Parameter Impedance parameters All circuit components resistors capacitors or inductors have parasitic components lurking in the shadows waiting for the unwary for example unwanted resistance in capacitors unwanted capacitance in inductors and unwanted inductance in resistors Thus simple components should be modeled as complex impedances for in fact that is what they are Impedance Z Figure 11 1 a shows the complex impedance definitions and Figure 11 1 b shows the vector representation of complex impedance Impedance Z is the total opposition that a circuit or device offers to the flow of alternating current at a given frequency Z contains a real and an imaginary part and it is expressed in rectangular form as Resistance and Reactance or in polar form as magnitude of Impedance and Phase as follows Z R jX Z 26 11 1 Z VR X 11 2 0 arctan I 11 3 R R R 11 4 Where Z Complex Impedance 9 R Resistance Q X Reactance Q Z Magnitude of Impedance Q Phase of Impedance deg or rad R Ser
85. P Bb 100 Ea E E 11 EN isis specially Dx 0 100 Q Accuracy AQ E E Es 1 Qt IQ tan P t gt lt 1 EEE 100 1xQ tan P Eb oe 100 10 Ea Ej E ll gt Q loaa QEM specially SESS Q gt 10 100 where D Measured vaulue of D a depends on measurement frequency as follows 1 MHz lt Frequency lt 100 MHz 0 6 100 MHz lt Frequency lt 500 MHz 000005 0 8 500 MHz lt Frequency lt 1000 MHz sese 1 2 1000 MHz lt Frequency lt 1800 MHz 2 0 45 Zx YolZx x 100 Qz Zx Measured value of Q impedance measurement value Q Z and Y depend on number of point averaging Nay OSC level Vosc impedance measurement value Z and the test head used as follows 4291B RF Impedance Material Analyzer Technical Data 12 5 Permeability Measurements Table 12 1 Z and Y when High Impedance Test Head is used Measurement Conditions Number of Meas Zs 9 Yo 5 Point OSC Signal Level Impedance Averaging Vosc Zx Nav Vosc lt 0 02 V x 0 2 0 001 x frm 2 PL x 5x 1075 2x 1077 xfiMmHz ILN lt 7 ose ose 0 02 V Vose lt 0 12 V 0 2 0 001 x frurmz 5x 107 4 2x1077 xfs Zx 2500 Q 0 2 0 001 x frurmz 5x 107 4 2x1077 x frye 0 12 s VS Vose Zx 500 Q 0
86. POINT mode is available for only MANUAL EXTERNAL and BUS trigger sources OPTION NOT INSTALLED GPIB only This error occurs when an GPIB command which is optional command is sent and the analyzer is not installed the option Please confirm options installed to the analyzer using OPT command see Chanpter 3 of GPIB Command Reference 233 220 40 231 22 284 280 Temperature Coefficient Measurement OUTPUT ATTENUATOR TEST FAILED An external test 21 OUTPUT ATTENUATOR fails See the Service Manual for troubleshooting Parameter error Indicates that a program data element related error occurred This error message is used when the analyzer cannot detect the more specific errors described for errors 221 through 229 Parameter not allowed More parameters were received than expected for the header For example the SRE command only accepts one parameter so receiving SRE 4 16 is not allowed PHASE LOCK LOOP UNLOCKED Sever error Contact your nearest Agilent Technologies office POST REGULATOR OUTPUT VOLTAGE OUT OF SPEC An internal test 4 A2 POST REGULATOR fails A power supply voltage of the A2 post regulator is out of its limits See the Service Manual for troubleshooting POWER ON TEST FAILED An internal test fails in the power on sequence the power on self test fails Contact your nearest Agilent Technologies office or see the Service Manual for troubleshooting POWER S
87. Permeability Measurement This menu can be accessed when Option 002 is installed and 16454A is selected as fixture to be used m COMPEN MENU Leads to the following softkeys which are used to perform a fixture compensation measurement D SHORT Measures SHORT for the fixture compensation COMP POINT Toggles between FIXED and USER DEFINED to select the fixture compensation measurement points When FIXED is displayed the analyzer performs fixture compensation measurements on points fixed across the full sweep range and the effective value for the points between these measured points will be calculated using the interpolation method When USER is displayed the analyzer performs fixture compensation measurements on the same points as the current stimulus setting Cl DONE COMPEN Completes the fixture compensation and then computes and stores the error coefficients m RESUME COMP SEQ Eliminates the need to restart a fixture compensation sequence that was interrupted to access some other menu Goes back to the point where the fixture compensation sequence was interrupted Measurement Block 5 59 Calkit Menu CAL KIT mm USER KIT SAVE USER KIT MODIFY mm Y DEFINE STANDARD Y OBEN CONDUCT G CAP C SHORT RESIST R INDUCT LS LOAD RESIST R REACT X STD DONE DEFINED LABEE Letter Menu KIT DONE MODIEIED RETURN Figure 5 46 Calkit Menu
88. Permeability Measurements Impedance Parameter Value Displayed for Magnetic Material Measurement When the 4291B measures magnetic materials the impedance parameter value displayed is calculated from the following impedance value Z Hm Ho C Z h In JU 27 b Where m 18 measurement complex permeability value of MUT b is inner diameter of MUT is outer diameter of MUT 11 32 Impedance Measurement Basics 4291B RF Impedance Material Analyzer 1 2 Technical Data Specifications describe the instrument s warranted performance over the temperature range of 0 C to 40 C except as noted Supplemental characteristics are intended to provide information that is useful in applying the instrument by giving non warranted performance parameters These are denoted as typical typically nominal or approximate Warm up time must be greater than or equal to 30 minutes after power on for all specifications Specifications of the stimulus characteristics and measurement accuracy are defined at the tip of APC 7 connector on the test head connected to the instrument Measurement Parameter Impedance parameters Z 62 Y 0 R X G B Cp Cs Lp Ls Rp Rs D Q ITI 65 Tx Ty Stimulus Characteristics Frequency Characteristics Operating frequency 1 MHz to 1 8 GHz Frequency resolution sessssssee 1 mHz Frequency reference Accuracy A ON lt 1
89. RIGHT SEAR 7 12 SEARCH TRK on OFF 7 11 segment 6 7 8 40 SEL D UTRC ON off 5 48 SELECT LETTER 5 46 serial number A 2 series circuit model 11 6 service manual 12 51 service manual add option 10 2 service menU 8 5 Smith polar marker 7 19 smth polar menu 7 19 Source 1 5 6 10 SPACE 5 46 1 5 span value 2 6 specifications 12 1 split display 5 33 standard model 5 61 1 5 6 14 start value 2 6 state 8 40 statistics ON OFF 7 19 status notations 2 7 step key 4 2 stimulus block 1 5 EE stop value 2 6 storage devices 8 48 sub marker 7 5 SUB MKR 7 12 Susceptance 11 4 Svc 2 7 Sweep 1 5 6 3 SWEEP AVG FACTOR 5 52 SWEEP AVG ON off 5 52 SWEEP AVG RESTART 5 52 sweep direction 6 5 sweep hold 6 12 sweep time 6 4 sweep type 6 5 System 1 6 8 3 system accessory 10 4 system controller 8 19 8 45 8 46 system overview 1 2 9 1 system rack 10 4 Index 11 Index 12 talker 8 44 Targ 2 5 TARGET 7 11 TARGET SEATARG 7 12 target menu 7 12 target search 7 11 teflon 5 64 terminator key 4 2 test head 2 15 test station 1 2 2 13 2 14 test station connector 2 3 TEXT MARKER 5 43 6 11 3 thickness 5 22 threshold 7 13 THRESHOLD on OFF 7 13 threshold value 7 26 THRESHOLD VALUE 7 13 time stamp 8 29 tint 5 44 title 2 8 5 35 5 46 tracking delta marker 7 6 TRACKING AMKR 7 6
90. SCALE Brings the trace data defined by the SCALE FOR key in view on the display with one keystroke Sweep values are not affected only scale and reference values The analyzer determines the smallest possible scale factor that will put all displayed data onto the vertical graticule SCALE DIV Changes the response value scale per division of the displayed trace In Smith polar and admittance chart formats this refers to the full scale value at the outer cireumference and is identical to the reference value REFERENCE POSITION Sets the position of the reference line on the graticule of a Cartesian display with 0 at the bottom line of the graticule and 10 at the top line It has no effect on a Smith polar or admittance chart format The reference position is indicated with a small triangle just outside the graticule on the left REFERENCE VALUE Changes the value of the reference line moving the measurement trace correspondingly In Smith polar and admittance chart formats the reference value is the same as the scale and is the value of the outer circle MARKER REFERENCE Makes the reference value equal to the marker s absolute value regardless of the delta marker value The marker is effectively moved to the reference line position In Smith polar and admittance chart formats this function makes the full scale value at the outer circle equal to the marker response value TOP VALUE Changes the value at the top line of the graticule m
91. Setting un m Pe iz va o zellaz le a mij a ies 3 gt lt oa QE pio oN o e v T Uno SOs RIIE 2 8 9 g tart Stop Center Span v Ri PH o z to NUR wn oO to o gt o o to un aE ap az lt 3 n e s llo ole 12 39 12 39 12 40 12 45 12 46 12 51 B 2 B 2 B 3 B 4 B 6 B 6 B 7 B 7 B 8 B 8 B 8 B 9 B 9 B 10 B 10 B 10 B 11 B 12 B 12 B 12 Contents 9 Contents 10 C Option 013 014 Temperature Coefficient Measurement N Introduction Setup and Installation Guide Required Equipment Equipment Setup Quick Start Calibration Setting the Test Fixture e Fixture Compensation Saving Status File Messages Index C 1 C 2 C 2 C 2 C 4 C 4 C 4 C 4 C 8 Figures 4291B System Overview Test Fixtures lll lll sn Material Test Fixtures for Option 002 High Temperature Test Heads and High Temperature Test Fixtures for Option 013 014 Analyzer Front Panel lr Screen Display Single Channel Cartesian Format Analyzer Rear Panel csl Pin Assignment of VO Port ls 5 Circuit of I O Port l l len 5 5 5 6 5 7 5 8 5 9 5 10 5 11 5 12 5 13 5 14 5 15
92. Station and Test Heads I O Port Figure 2 4 shows the pin assignment of I O port on the rear panel Figure 2 4 Pin Assignment of I O Port The signals carried through each pin are described below OUT 0 thru 7 Output signals to external devices Controlled by GPIB commands and HP Instrument BASIC statements and functions as described below Once SYST COMM PAR TRAN DATA is executed the signal is latched until this command is executed again or power OFF IN 0 thru 4 Input signals from external devices Read by the GPIB command SYST COMM PAR DATA as described below m Related GPIB Commands There are two GPIB commands that directly control an I O port ri SYST COMM PAR TRAN DATA This command outputs 8 bit data to the OUT 0 thru 7 lines The OUT 0 signal is the LSB least significant bit The OUT 7 signal is the MSB most significant bit o SYST COMM PAR DATA This command inputs data from the 4 bit parallel input port to the analyzer and outputs the data to the controller m Related HP Instrument BASIC Statement and Function HP Instrument BASIC can access an I O port directly by using the following statement and function O WRITEIO 15 0 A This statement outputs decimal value A as 8 bit data to the OUT 0 thru 7 lines The OUT 0 signal is the LSB least significant bit The OUT 7 signal is the MSB most significant bit ri READIO 15 0 Front and Rear Panel Test Station and Test H
93. This setting does not change even when the line power is cycled or the Preset key is pressed The factory setting is LIF STOR DEV Selects between the floppy disk drive and the memory disk as the storage device DISK shows the floppy disk is selected and MEMORY shows the memory disk is selected Instrument State Block 8 33 Memory disk data is lost when the power is tuned off Use the floppy disk to store important data because the memory disk data is lost when the power is turned off The storage selection does not change even when the line power is cycled or the Preset key is pressed 8 34 Instrument State Block Gave Define Save Data Menu RAW Save a on 2 CAL on OFF DATA DATA ONLY DEFINE on OFF SAVE DATA MEM on OFF DATA TRACE on OFF MEM TRACE on OFF RETURN CE008019 Figure 8 20 Define Save Data Menu m RAW DATA ON off Toggles saving or not saving the raw data arrays CAL ON off Toggles saving or not saving the calibration coefficients arrays m DATA ON off Toggles saving or not saving the data arrays MEM ON off Toggles saving or not saving the memory arrays DATA TRACE ON off Toggles saving or not saving the trace arrays MEM TRACE ON off Toggles saving or not saving the memory trace arrays m USER TRACE ON off Toggles saving or not saving the user trace arrays Instrument State Block 8 35
94. active channel When the eross channel is turned on this softkey moves the marker to the peak of the active channel and changes the parameter of the inactive channel MKRA SPAN Changes the stimulus span value to the difference value between the marker and Amarker values When the cross channel CROSS CHAN is turned off this softkey changes the span value of the active channel When the cross channel is turned on this softkey changes the parameter of the inactive channel MKRA CENTER Changes the stimulus center value to the difference value between the marker and Amarker values When the cross channel CROSS CHAN is turned off this softkey changes the center value of the active channel When the cross channel is turned on this softkey changes the parameter of the inactive channel ZOOMING APERTURE Sets the zooming aperture value as a percentage of the span CROSS CHAN on OFF Selects the destination channel of the Marker functions When the cross channel is turned off a Marker function changes the stimulus or the amplitude value of the active channel When the cross channel is turned on a Marker function changes the parameters of the inactive channel CROSS CHAN ON off Selects the current inactive channel as the destination channel CROSS CHAN on OFF Selects the current active channel as the destination channel Turn off the channel coupling when the cross channel function is used When you want to change one of chan
95. arrays When the current measurement point is different from the calibration measurement point the coefficient value is interpolated from the fixed point calibration coefficient arrays or the user defined point calibration coefficient arrays Calibration Coefficient Arrays Because the analyzer measures the three standards at three different OSC levels automatically when the calibration measurement is performed calibration data arrays consist of nine arrays These arrays are directly accessible via GPIB or by using the floppy disk drive or the memory disk Error Collection When a measurement calibration has been performed error correction removes the repeatable systematic errors stored in the calibration coefficient arrays from the raw data arrays See Cal in Chapter 5 and Calibration Concepts in Chapter 11 for details Averaging This is one of the noise reduction techniques Two types of averaging techniques are provided sweep averaging and point averaging the point averaging processes before the ratio processing The sweep averaging calculation involves taking the complex exponential average of up to 999 consecutive sweeps The point averaging calculation involves taking the complex average of up to 999 measurements on each measurement point See Bw Avg in Chapter 5 Raw Data Arrays These arrays store the results of all the preceding data processing operations These arrays are directly accessible via GPIB
96. consent of the Agilent Technologies Agilent Technologies Japan Ltd Component Test PGU Kobe 1 3 2 Murotani Nishi ku Kobe shi Hyogo 651 2241 Japan Copyright 1997 1998 1999 2001 2002 Agilent Technologies Japan Ltd For additional important information about serial numbers read Serial Number in Appendix A Manual Printing History The manual s printing date and part number indicate its current edition The printing date changes when a new edition is printed Minor corrections and updates that are incorporated at reprint do not cause the date to change The manual part number changes when extensive technical changes are incorporated December 1997 First Edition part number 04291 90020 September 1998 Second Edition part number 04291 90080 December 1999 Third Edition part number 04291 90030 January 2001 Fourth Edition part number 04291 90030 September 2002 Fifth Edition part number 04291 90040 MS bos 9 is a registered trademark of Microsoft Corporation APC 7O is a registered trademark of Bunker Ramo Corporation Safety Summary Note uy Note i Y Ground The Instrument The following general safety precautions must be observed during all phases of operation service and repair of this instrument Failure to comply with these precautions or with specific WA RNINGS elsewhere in this manual may impair the protectio
97. correctly performed or adhered to could result in damage to or destruction of part or all of the product Caution Y This Caution sign denotes a hazard It calls attention Note This Note sigh denotes important information It Y calls attention to a procedure practice condition or the like which is essential to highlight Affixed to product containing static sensitive devices use anti static handling procedures to prevent 3 electrostatic discharge damage to component Typeface Conventions vi Bold Italics Computer HARDKEYS SOFTKEYS Boldface type is used when a term is defined For example icons are symbols Italic type is used for emphasis and for titles of manuals and other publications Italic type is also used for keyboard entries when a name or a variable must be typed in place of the words in italics For example copy filename means to type the word copy to type a space and then to type the name of a file such as filet Computer font is used for on screen prompts and messages Labeled keys on the instrument front panel are enclosed in Softkeys located to the right of the LCD are enclosed in Certification Warranty Agilent Technologies certifies that this product met its published specifications at the time of shipment from the factory Agilent Technologies further certifies that its calibration measurements are traceable to the United States National Institute
98. firmware Option 011 Delete high impedance test head Option 012 Add low impedance test head Option 013 Add high temperature high impedance test head e head e Option OBW Add Service Manual Option 1D5 Add high stability frequency reference Option 1A2 Keyboard less s Option 1CM Rack mount kit Option ICN Handle Kit D Option 1CP Rack mount and handle kit Measurement accessories available 16194A High temperature component fixture 16453A Dielectric material test fixture 16454A magnetic material test fixture 16091A Coaxial termination fixture set 16092A Spring clip test fixture 16093A B Binding post test fixtures 2 16094A Probe test fixture l l System accessories available ls System rack 4l Printer 4 lr GPIB cable 2 llle Service Accessories Available Collet removing tool Agilent part number 5060 0236 Collet removing tool guide Agilent part number 04291 21002 2 rrr 6 Slot collet Agilent part number 85050 20001 11 Impedance Measurement Basics Impedance parameters Impedance Do Admittance DD eee Reflection Coefficient T ln Series and Parallel Circuit Models
99. following equation 11 30 Impedance Measurement Basics Permeability Measurements PM jp OT IY 1 11 87 Ho F 355 The analyzer measures impedance Z and calculates ji using this equation Characteristics of the Test Fixture Residual Parameter The 16454A has residual impedance The residual impedance Zres is represented by a series impedance as shown in Figure 11 23 HP16454A Ceotioz4 Figure 11 23 Residual Impedance of the 16454A Assuming that the impedance value of the empty test fixture is known the residual impedance can be specified by measuring the fixture with no MUT empty Pres Zsm Zss 11 88 Where Zss is the ideal value of the impedance when the fixture is empty Zsm is the measurement value of the impedance when the fixture is empty Elimination of Residual Impedance Effects in the Test Fixture SHORT Fixture Compensation The SHORT fixture compensation can eliminate the residual impedance effect When the SHORT empty compensation measurement has been performed the compensated impedance comp can be expressed by the following equation Zeomp Zn gt Zres 11 89 Assuming that Z has only an inductance factor Z jwLss and using the compensated impedance value Zeomp the permeability of the MUT can be derived from m and Z as follows Qt Zm Zem jig pt 11 90 Impedance Measurement Basics 11 31
100. limit testing can be either ON or OFF while limits are defined As new limits are entered the tabular columns on the display are updated and the limit lines if on are modified to the new definitions The complete limit set can be offset in either stimulus or amplitude value How Limit Lines are Entered 8 40 Before limit lines can be explained the concept of segments must be understood A segment is the node of two limit lines See Figure 8 26 If Segments are defined as follows Limit lines are set like this START 1MHz STOP 5MHz Stimulus Segment Break Point 1 200MHz 200MHz 300MHz 400MHz Limit lines start at the START frequency Upper Limit 5k Segment 3 Segment 1 Limit lines cqntinue until the STOP frequency Segment 1 Segment 2 E 06008040 100 MHz 200 MHz 300 MHz 400 MHz 500 MHz START Stimulus Break Points STOP frequency of Limit Lines frequency Figure 8 26 The Concept of Segments as a Point between Two Sets of Limit Lines Instrument State Block As you can see in Figure 8 26 segments are distinct points that define where limit lines begin or end Limit lines span the distance between segments and represent the upper and lower test limits Figure 8 26 shows another important aspect of limit lines The far left hand side of a set of limit lines will continue from the minimum stimulus value Limit Line Concept s
101. loss tangent accuracy at which a normal test head is used Eas is the effect of temperature drift on the accuracy as follows Eas TAT Eys is the hysterisis of the effect of temperature drift on the accuracy as follows TAT 3 Erg where T is temperature coefficient as follows Te Ki Ko K3 K 1 x 10 5 x 50 300f 21x10 1 0 01 Fh D 10 K 1 x 10 x 1 10f FOL 7 3 207 Ur 1 20 f 1 0 01 F 2 1 10 f f Measurement Frequency GHz F ndn mm h is the height of MUT mm b is the inner diameter of MUT c is the outer diameter of MUT Hrm is the measured value of permeability K 2 x 1075 x 1 30f The illustrations of temperature coefficient Tc are shown in Figure 12 37 to Figure 12 39 12 46 4291B RF Impedance Material Analyzer Technical Data Material Measurement Accuracy with High Temperature Test Head AT is difference of temperature between measurement condition and calibration measurement condition as follows AT T meas Tal Tmeas Temperature of Test Head at measurement condition Tear Temperature of Test Head at calibration measurement condition 4291B RF Impedance Material Analyzer Technical Data 12 47 Material Measurement Accuracy with High Temperature Test Head hl 0 5 np DEREN Hlr 3 r 10 x SN juu B H re1000 r2300 115100 Hir 30 1800M Frequency Hz Figure
102. marker on the present marker position O SUB MKR 1 2 3 4 5 6 7 These keys put a sub marker at the present marker position Note a For more information on peak definition see Peak Definition in the Y last part of this chapter 7 14 Marker Block Search Range Menu E MENU 7 Search RANGE MENU PART SRCH ON off MKR A gt SEARCH RNG MKR gt LEFT RNG MKR gt RIGHT RNG RETURN Figure 7 10 Search Range Menu PART SRCH on OFF Turns partial search ON or orf The search range is defined by two small triangles at the bottom of the graticule If no search range is defined the search range is the entire trace MKRA SEARCH RNG Sets the partial search range to the range between the marker and Amarker MKR LEFT RNG Sets the left lower border of the partial search range at the current position of the marker MKR RIGHT RNG Sets the right higher border of the partial search range at the current position of the marker Marker Block 7 15 Widths Menu 7 16 Marker Block SEARCH IN SEARCH OUT WIDTHS WIDTHS OFF on OFF WIDTH VALUE MKRVAL 2 MKRVAL 2 MKRVAL 2 FIXED RETURN RETURN y Figure 7 11 Widths Menu SEARCH IN Searches for the cutoff point on the trace that is within the current cutoff points SEARCH OUT Searches for the cutoff point on the trace outside the current cutoff points WIDTHS on O
103. not allowed by the analyzer at this point in parsing CABLE ISOL N TEST FAILED An external test 27 fails See the Service Manual for troubleshooting CALIBRATION ABORTED The calibration in progress was terminated due to a change of the stimulus parameter or calibration measurement points For example m Changing CAL POINT FIXED between CAL POINT USER SENSe CORRectioni COLLect FPOints FIXed USER CALIBRATION REQUIRED No valid calibration coefficients were found when you attempted to perform fixture compensation See Users Guide for information on how to perform calibration CAN T CALCULATE EQUIVALENT PARAMETERS Data is not match to the equivalent circuit and cannot calculate the parameters CAN T CHANGE IN LIST SWEEP When list sweep is selected the following parameters are not allowed to be changed m Stimulus center span start stop m Number of Point m OSC level 93 74 281 Temperature Coefficient Measurement Modify the list table to change these parameters in the list sweep CAN T CHANGE WHILE DUAL CHAN OFF The cross channel CALCulate EVALuate EFFect 0N 1 cannot be turned on when dual channel is off Turn on the dual channel before the cross channel is turned on CAN T CHANGE ANOTHER CONTROLLER ON BUS The analyzer cannot assume the mode of system controller until the system controller is removed from the bus or relinquishes the bus CAN T CHANGE HIGH TEMP TEST HEAD CONNECTED
104. of Standards and Technology to the extent allowed by the Institution s calibration facility or to the calibration facilities of other International Standards Organization members This Agilent Technologies instrument product is warranted against defects in material and workmanship for a period of one year from the date of shipment except that in the case of certain components listed in General Information of this manual the warranty shall be for the specified period During the warranty period Agilent Technologies will at its option either repair or replace products that prove to be defective For warranty service or repair this product must be returned to a service facility designated by Agilent Technologies Buyer shall prepay shipping charges to Agilent Technologies and Agilent Technologies shall pay shipping charges to return the product to Buyer However Buyer shall pay all shipping charges duties and taxes for products returned to Agilent Technologies from another country Agilent Technologies warrants that its software and firmware designated by Agilent Technologies for use with an instrument will execute its programming instruction when property installed on that instrument Agilent Technologies does not warrant that the operation of the instrument or software or firmware will be uninterrupted or error free Limitation Of Warranty The foregoing warranty shall not apply to defects resulting from improper or inade
105. of the capacitor eAbove approx 10 kQ Use parallel circuit model eBelow approx 10 Q Use series circuit model eBetween above values Follow the manufacturer s recommendation Selecting Circuit Mode of Inductance The following description gives some practical guide lines for selecting the inductance measurement mode that is which circuit mode to use Large Inductance The reactance at a given frequency is relatively large compared with that of a small inductance so the parallel resistance becomes more significant than the series component Therefore a measurement in the parallel equivalent circuit mode L D Lp Q or L G is more suitable see Figure 11 5 11 8 Impedance Measurement Basics Series and Parallel Circuit Models Large L High Z Rp More significant l Rs Less significant Ceotio05 Figure 11 5 Large Inductance Circuit Mode Selection Small Inductance For low values of inductance the reactance becomes relatively small compared with that of a large inductance so the series resistance component is more significant Therefore the series equivalent circuit mode L D or L Q is appropriate see Figure 11 6 Small f Sp f Ls Z P gt Low Zi Less significant Rs ore significant Ceotio0G Figure 11 6 Small Inductance Circuit Mode Selection The following is a rule of thumb for selecting the circuit model according to the impedance of the
106. of the marker MKR STOP Sets the stimulus stop value to the stimulus value of the marker N MBER of POINTS Sets the number of points for the segment The total number of points for all segments cannot exceed 801 0SC LEVEL Sets the OSC level segment by segment POINT AVG FACTOR Sets the averaging factor of the averaging on point for the segment MORE Leads to the following softkeys O SEGMENT START Sets the starr frequency of a segment 3 STOP Sets the stop frequency of a segment 3 CENTER Sets the CENTER frequency of a segment 3 SPAN Sets the frequency sPAN of a segment about a specified center frequency SEGMENT QUIT Returns to the previous softkey menu without saving the modified segment SEGMENT DONE Saves the modified segment and returns to the previous softkey menu Stimulus Block 6 9 Source Source Menu 6 10 Stimulus Block Source OSC LEVEL OSC Bu VOLT AMPERE dBm RETURN CW FREQ DC BIAS ON off DC BIAS MENU i BIAS SRC VOLTAGE BIAS VOLTAGE BIAS CUR LIMIT BIAS CURRENT BIAS VOLT LIMIT RETURN CE006005 Figure 6 7 Softkey Menus Accessed from the Key OSC LEVEL Makes OSC level the active function OSC UNIT Leads to the following softkeys which are used to select the OSC lev
107. on temperature conditions as follows within referenced to 2345 C 0 0 eee 4 dB 0 C to 18 C 28 C to 40 C 2 0 6 dB B depends on OSC level as follows 0 5 Vims gt Vose gt 120 MVimg cence 0 dB 12 5 mArms 2 Tose 2 3MA ms 1 9 dBm gt Pos gt 10 dBm 120 MVims gt Vose gt 1 2 MVems 00 eese 1 dB 3 mArms gt Tose 2 30 HA ms 10 dBm gt Pos gt 50 dBm 1 2 MVims gt Vose gt 0 2 MVems oo cee cece cece eee 2 dB 30 Arms gt Tose gt 5 H rms 50 dBm gt Pos gt 66 1 dBm Output impedance 40 Q Nominal value Level Monitor Monitor accuracy OSC level sssse Same as OSC level accuracy typical DC bias Twice as bad as specifications of dc level accuracy typical 4291B RF Impedance Material Analyzer Technical Data 12 11 Option 013 and 014 High Temperature Test Heads Basic Measurement Accuracy Conditions of accuracy specifications m OPEN SHORT 50 Q calibration must be done Calibration ON m Averaging on point factor must be larger than 32 at which calibration is done m Measurement points are same as the calibration points m Environment temperature is within 5 C of temperature at which calibration is done and within 13 C to 33 C Beyond this environmental temperature condition and within 0 C to 40 C accuracy is twice as bad as specified m Bending cable should be smooth and the bending angle is less than 30 m Ca
108. or using the floppy disk drive or the memory disk Note that the numbers here are still complex pairs Data Processing Port Extension This is equivalent to line stretching or artificially moving the measurement reference plane Fixture Compensation Coefficient Arrays When a fixture compensation measurement has been performed and fixture compensation is turned on the fixture compensation removes the repeatable systematic error This error is caused by stray and residual impedance along the fixture used This error information is stored in the fixture compensation arrays by the port extension process See Cal in Chapter 5 and Calibration Concepts in Chapter 11 for details When the permittivity measurement test fixture is selected these arrays are not used These arrays are directly accessible via GPIB or by using the floppy disk drive or the memory disk Fixed Point Fixture Compensation Coefficient Arrays and User Defined Point Fixture Compensation Coefficient Arrays When a compensation measurement is performed the coefficient values at each compensation measurement point are stored in these arrays These arrays are not accessible via GPIB Compensation Coefficient Interpolation When compensation measurements have been performed stimulus settings have been changed or compensation is turned on the compensation coefficient at the current measurement points is calculated from either the fixed point fixture compen
109. overwrites an old file with a new one using the same file name GET Enters the GET command in the BASIC command line The GET command loads a specified ASCII file into the editor memory PURGE Enters the PURGE command in the BASIC command line The PURGE command deletes a specified file INITIALIZE Enters the INITIALIZE command in the BASIC command line The INITIALIZE command formats a disk MSI INTERNAL The MSI INTERNAL command specifies a disk device INTERNAL selects the floppy disk MEMORY selects the memory disk SCRATCH Enters the SCRATCH command in the BASIC command line Pressing the Return key after the command deletes a currently edited program from the memory RENumber Enters the RENumber command in the BASIC command line Pressing the Return key after the command renumbers the line numbers of a program LIST Enters the LIST command in the BASIC command line The LIST command outputs the program list to the screen COMMAND ENTRY Displays the softkeys that are used to enter BASIC commands The active entry area displays the letters digits and some special characters Three sets of letters can be scrolled using the step keys fr and Q Instrument State Block 8 7 Instrument State Block SELECT LETTER Selects the character pointed to by f SPACE Inserts a space BACK SPACE Deletes the last character entered ERASE TITLE Deletes all characters entered DONE Terminates command entry and execu
110. print setup menu STANDARD COLOR For a color printer For a black and white printer m COPY ABORT Aborts a print in progress COPY SKEY on OFF Specifies whether to print out softkey labels by switching ON OFF m COPY TIME ON off Turns the time stamp on or off for a print the time and date are printed out first followed by the information shown on the display See Clock Menu for setting the internal clock m PRINT SETUP Leads to the Print Setup menu which is used to allow you to copy the display to a printer For information on compatible printers see the Chapter 12 in this manual set m ORIENT PORTRAIT Specifies the orientation of printer sheets If your printer does not support landscape printing this setting is ignored PORTRAIT LANDSCAPE Portrait orientation Landscape orientation m FORMFEED ON off Specifies whether to deliver a sheet after one screen is printed out by switching on off When the sheet Instrument State Block 8 23 8 24 orientation is specified to LANDSCAPE the FORMFEED setting is ignored and sheets are always ejected after each screen printout m LIST VALUES provides a tabular listing of all the measured data points and their current values When DUAL CHAN and COUPLED CHAN are ON the measured values of both channels are listed at the same time When LIMIT LINE and LIMIT TEST are ON the limit information is also listed together with the measured values The Scr
111. recalled from non volatile memory battery backup memory If power to the non volatile memory is lost the analyzer will have certain parameters set to factory settings Factory Setting lists the factory settings The operating time of the battery backup memory is approximately 72 hours The battery is automatically recharged while the instrument is ON The recharge time time required to fully recharge the battery is approximately 10 minutes When line power is cycled the analyzer performs a self test routine Upon successful completion of the self test routine the instrument state is set to the following preset conditions The same conditions are true following a PRES or RST command via GPIB Input Range and Default Setting B 1 FORMAT S Function Range Preset Value Power ON Factory default Setting Measurement Mode Active channel Dual channel Active channel Active channel Measurement Parameter Chl Impedance meas Z 02 R X Y 05 G B T 64 Tx Z Z Ty Cp Cs Lp Ls Rp Rs D Q Ch2 Impedance meas Z 02 R X Y y G B T Tx 0 0 Py Cp Cs Lp Ls Rp Rs D Q Chl e meas e tan 6 e e Z 07 R X Y 6y e e G B IE Oy Tx Ty Cp Cs Lp Ls Rp Rs D Q Ch2 e meas e tan 6 e e Z 07 R X Y 6y e e G B IE Oy Tx Ty
112. represented by F parameters of 2 terminal pair as shown in Figure 11 16 Using this model the residual and stray factors can be eliminated zm gt E 5 C D TEST HEAD TEST FIXTURE Ceotlozo Figure 11 16 Test Fixture Represented by the F matrix of a Two Terminal Pair Network Vi _ A B V3 1 6 p i 11739 The actual impedance value of the DUT Z and the measurement value Zm are represented by the input and output current and voltage as follows Vi 11 36 sy 11 36 z 11 37 Io Then Zx is Zm m Beompen Acompen SO 11 Lo A P 1 Zm Ceompen 38 Where Acompen D A Beompen B D Ccompen C A There are three unknown parameters Therefore three standards are needed for perfect compensation When Acompen Beompen and Ceompen are given Zy is calculated To get Acompen Beompen and Ceompen the 4291B executes measurements for OPEN SHORT and LOAD compensation Impedance Measurement Basics 11 21 Fixture Compensation Compensation Coefficient for Each Compensation 11 22 Impedance Measurement Basics For fixture compensation three compensations OPEN SHORT and LOAD are provided for the analyzer These compensations can be turned on individually After the compensation measurements have been done and tuned on the compensation coefficients Acompen Beompen ANA Ceompen are automatically calculated and the measurement v
113. see Chapter 8 1 6 Introduction Front and Rear Panel Test Station and Test Heads This chapter describes the features of the analyzer the test station and the test heads It provides illustrations and descriptions of the analyzer s front panel features the LCD and its labels and the rear panel features and connectors It also includes illustrations and descriptions of the Test station and test heads Front Panel Analyzer functions are activated from the front panel Figure 2 1 by using the front panel hardkeys or softkeys In this manual all front panel hardkeys and softkey labels are shown as Hardkey and Softkey respectively 1 Front Panel Keys and Soft Keys AED cs mazime ANLE C JACTIVE SHAM HELL ENTRY T u 2 G P B o mj 3 0 L oo REMOTE O Indicator aaa 63 3 overt 3 PRESET LL aa ao Key 4 LJ eg TMARTER ETE erm i E Ea Om tt LS 1 amp 6 316369 16 Jj 7 t pn i AN AN J all Ica a Qao
114. service mode See the Service Manual for troubleshooting CPU BACKUP SRAM R W ERROR An internal test 2 Al VOLATILE MEMORY fails The Al CPU s BACKUP SRAM does not work properly Replace the Al CPU with a new one See the Service Manual for troubleshooting 66 230 225 222 231 229 Temperature Coefficient Measurement CPU INTERNAL SRAM R W ERROR An internal test 2 A1 VOLATILE MEMORY fails The A1 CPU s internal SRAM does not work properly Replace the A1 CPU with a new one See the Service Manual for troubleshooting CURRENT EDITING SEGMENT SCRATCHED The current editing the table of list sweep or the limit line is scratched It is occur when the operation other than editing the table is executed before terminate editing the table SENSe LIST SAVE or CALCulate LIMit SAVE Data corrupt or stale Possibly invalid data New reading started but not completed since last access Data out of memory The analyzer has insufficient memory to perform the requested operation Data out of range A legal program data element was parsed but could not be executed because the interpreted value was outside the legal range as defined by the analyzer see IEEE 488 2 11 5 1 1 5 Data questionable Measurement accuracy is suspect Data type error The parser recognized an unallowed data element For example numeric or string data was expected but block data was encountered DC BIAS OVERLOAD Hard
115. small resistance small inductance or large capacitance O D FACTOR D Measures dissipation factor D Q FACTOR Q Measures quality factor Q DUAL PARAMETER Leads to the Dual Parameter menu which are used to select parameters to be measured for both channels with one key stroke m FIXTURE 16454 Leads to the Fixture Menu which is used to select the test fixture used with the analyzer The selected test fixture is displayed in brackets in the softkey label m MATERIAL SIZE Leads to the Material Size Menu which is used to set the diameters of the magnetic material to be measured 5 24 Measurement Block Magnetic Material Measurement Complex Permeability Measurement Menu Option 002 only IMPEDANCE Z I ADMITTANCE o l REFL COEF E PERMEABLTY H 4 DUAL PARAMETER FIXTURE Magnetic Material 16454 Fixture Menu MATERIAL Magnetic Material SIZE Size Menu CE005055 Figure 5 20 Complex Permeability Measurement Menu Option 002 only This softkey menu can be accessed at the following conditions m Format the polar Smith admittance or complex plane format is selected m Fixture 16454A is selected m IMPEDANCE Z Measures complex impedance on the polar or complex plane format This softkey is not available when Smith or admittance chart is selected m ADMITTANCE Y Measures complex admi
116. stored in memory for this channel a warning message is displayed O DATA and MEMORY Displays both the current data and the memory traces O DATA MEMORY Stores the current active measurement data in the active memory of the active channel It then becomes the memory trace for use in subsequent math manipulations or display When the NOP is changed the memory trace becomes invalid c SELECT MEMORY NO Selects a memory trace as the active memory trace The analyzer can store traces into several memory traces maximum number of memory traces depends on the NOP However the display functions such as scaling and marker functions affect the active memory trace specified by this softkey Measurement Block 5 33 5 34 Measurement Block O SEL D MEM ON off Sets the state of the memory trace always to display the memory trace or to erase the memory trace even each memory trace is inactive Regardless of this setting the active memory trace is always displayed The state of each memory trace can be set to display or erase traces individually and pressing this key changes the state of the current active memory trace selected by SELECT MEMORY NO Therefore it is necessary to select a memory trace before changing this state See the following example For example To erase memory trace No 2 Assuming that two memory traces have been used 1 2 Press SELECT MEMORY NO 2 x1 No 2 memory trace is selected Press
117. the numeric entry keys After you change the second setting press ENTER to restart the clock H3 ENTER Restarts the internal clock 3 CANCEL Returns to the previous page Pressing this key does not affect the internal clock setting DATE DD MM YY Displays the current date on the active entry area to adjust date D MON Enables changing the month setting using the knob or the numeric entry keys After you change the month setting press ENTER to restart the clock H DAY Enables changing the day setting using the knob or the numeric entry keys After you change the day setting press ENTER to restart the clock LH YEAR Enables changing the year setting using the knob or the numeric entry keys After you change the year setting press ENTER to restart the clock Instrument State Block 8 11 A ENTER Restarts the internal clock CANCEL Returns to the previous page Pressing this key does not affect the internal clock setting O DATE MODE MonDayYear Changes the displayed date to the month day year format 3 DayMonYear Changes the displayed date to the day month year format 8 12 Instrument State Block System Beeper Menu System BEEP DONE ON off BEEP WARN BEEPER on OFF MENU RETURN p Figure 8 8 Beeper Menu m BEEP DONE ON off Toggles an annunciator that sounds to indicate the completion of operations such as calibration or instrument state save m BEE
118. to a known standard preset state from any step of any manual procedure A complete listing of the instrument preset conditions is provided in Appendix B 4 Test Station Connectors The test station connects to these connectors 5 Floppy Disk Drive Stores the measurement data instrument status list sweep tables and HP Instrument BASIC programs The applicable disk formats are LIF logical interchange format and DOS disk operating system format 6 LINE Switch Turn oN oFF the 4291B Front and Rear Panel Test Station and Test Heads 2 3 Screen display Displays a grid on which the measurement data is plotted the currently selected measurement traces and other information describing the measurement Figure 2 2 shows the locations of the different information labels In addition to the full screen display shown in Figure 2 2 a split display is available see Display in Chapter 5 In this case information labels are provided for each half of the display The screen can also be used as the HP Instrument BASIC display HP Instrument BASIC uses either a full screen display or a half screen display below the graticule display as a text screen D 8 e C6002002 Figure 2 2 Screen Display Single Channel Cartesian Format 1 Active Channel Displays the number of the current active channel selected with the keys in the act
119. to the stimulus value of the marker When the cross channel CROSS CHAN is turned off this softkey changes the start value of the active channel When the eross channel is turned on this softkey changes the parameter of the inactive channel m MKR STOP Changes the stimulus stop value to the stimulus value of the marker When the cross channel CROSS CHAN is turned off this softkey changes the stop value of the active channel When the cross channel is turned on this softkey changes the parameter of the inactive channel Marker Block 7 7 7 8 Marker Block MKR REFERENCE Sets the reference value to the marker s amplitude value When the cross channel CROSS CHAN is turned Off this softkey changes the reference value of the active channel When the cross channel is turned on this softkey changes the parameter of the inactive channel MKR ZOOM Changes the stimulus center value to the stimulus value of the marker and changes the stimulus span value to the value specified by the zooming aperture When the cross channel CROSS CHAN is turned off this softkey changes the parameters of the active channel When the cross channel is turned on this softkey changes the parameters of the inactive channel PEAK CENTER Moves the marker to the maximum or minimum peak and changes the stimulus center value to the stimulus value of the peak When the cross channel CROSS CHAN is turned off this softkey changes the center value of the
120. 0 to 1x10 1 MQ 1 MQ Y G B 1x10 to 1x10 1s 1s I Tx Ty 1x10 to 1x 10 1 1 Cp Cs 1x10 to 1x 10 1 mF 1 mF Lp Ls 1x10 to 1x 10 10H 10H 1x10 to 1x10 200 200 D 1x10 to 1x10 1 1 Q 1x10 to 1x10 lk lk Scale bottom value logarithm scale IZ R Rp Rs X 500x 10 to 500x 106 19 19 Y G B 500x 10 to 500x 106 lus lus I Tx Ty 500x 10 to 500x 106 1x 10 1x 10 Cp Cs 500x 10 to 500x 106 1 nF 1 nF Lp Ls 500x 10 to 500x 106 10 pH 10 pH 0 500x 10 to 500x 106 10 2 10 2 D 500x 10 to 500x 106 lu lu Q 500x 10 to 500x 106 1 1 Reference X Value 500x 10 to 500x 106 0 0 Reference Y Value 500x 10 to 500x 106 0 0 Scale for Data Memory 1 to 16 Data Data Data amp Memory Scale Couple Uncouple Couple Couple X axis unit Maximum 4 characters U U Y axis unit Maximum 4 characters U U X axis left value 8x10 to 8x10 1x 10 1x 10 X axis right value 8x10 to 8x 10 1 8x10 1 8x10 Y axis top value 1x10 to 1x10 100 100 Y axis bottom value 1x10 to 1x101 0 0 X Y axis couple ON OFF ON ON Input Range and Default Setting B 5 Function Range Preset Value Power ON Factory default Setting Sweep Averaging ON OFF OFF OFF Sweep Averaging Factor 1 to 999 16 16 Point Averaging ON OFF OFF OFF Point Averaging Factor 1 to 999 1 1 Function Range Pr
121. 0 3 mm Frequency Hz CE001209 Figure 12 16 Typical Permittivity Measurement Accuracy Qthickness 0 3 mm Frequency Hz CE001210 Figure 12 17 Typical Permittivity Measurement Accuracy Qthickness 1 mm 4291B RF Impedance Material Analyzer Technical Data 12 25 Option 002 Material Measurement Frequency Hz CE001211 Figure 12 18 Typical Permittivity Measurement Accuracy Othickness 3 mm 12 26 4291B RF Impedance Material Analyzer Technical Data Option 002 Material Measurement t 0 3 mm T w x o n x Ww cx Cc o Frequency Hz Figure 12 19 Typical Dielectric Loss Tangent tan Measurement Accuracy thickness 0 3 mm i This graph shows only frequency dependence of E to simplify it The typical accuracy of tan is defined as E Ej refer to Supplemental Note 9 Characteristics for Option 002 Material Measurement 4291B RF Impedance Material Analyzer Technical Data 12 27 Option 002 Material Measurement T w x o x pes Ww a Cc o Frequency Hz CE001213 Figure 12 20 Typical Dielectric Loss Tangent tan Measurement Accuracy thickness 1 mm Note a This graph shows only frequency dependence of E to simplify it The Y typical accuracy of tan is defined as E Ey refer to Supplemental Characteristics fo
122. 0 ppm Precision frequency reference Option 1D5 Accuracy 0 C to 40 C aoaaa lt 1 ppm Source Characteristics OSC level Voltage range 1 MHz lt Frequency lt 1 GHz When terminal is open o 0 2 MVims to 1 Vims 1 GHz lt Frequency lt 1 8 GHz When terminal is open MEME 0 2 MVims to 0 5 Vims Current range 1 MHz lt Frequency lt 1 GHz When terminal is shorted o 4 Ams to 20 MAms 1 GHz lt Frequency lt 1 8 GHz When terminal is shorted 4291B RF Impedance Material Analyzer Technical Data 12 1 Permeability Measurements 4 Arms to 10 MAyms Power range 1 MHz lt Frequency lt 1 GHz When terminating with 50 Q 67 dBm to 7 dBm 1 GHz lt Frequency lt 1 8 GHz When terminating with 50 Q 67 dBm to 1 dBm OSC level resolution AC voltage resolution 0 22 Vims lt Vosc lt 1 Vims e eh hh eh hls 2 mV 70 mVems lt Vosc 220 MVemg i e 0 5 mV 22 MVems lt Vosc YO MVemg 1 cece eect eens 0 2 mV 7MVrms lt Vosc 22 MVemg 6 cece cece eens 0 05 mV 2 2 mVems lt Vosc lt 7 mVems A 0 02 mV 0 7 MVims lt Vosc 2 2 MVems ooo cece cece eee 0 005 mV 0 2 MVims Vosc 0 7 MVems esses 0 002 mV AC current resolution 4 4 MArms lt losc lt 20 MArms ehe e e hn 40 pA 1 4 MArms lt losc lt 4 4 MArms A 10 pA 0 44 mAms lt losc 1 4 mAgms 6 0 0 4 pA 140 pAms lt losc 440 pArns e 1 pA O 44 pArms lt losc 140 pArms eee 0 4 pA O 14 pAm
123. 00x 10 to 100x 108 0 0 AUX offset 100x10 to 100x 106 0 0 Equivalent Circuit Circuit A B C D E F A A Equivalent Parameter R4 1x101 to 1x 1018 0 0 Equivalent Parameter L 1x101 to 1x 1018 0 0 Equivalent Parameter Co 1x101 to 1x 1018 0 0 Equivalent Parameter C4 1x101 to 1x 1018 0 0 Disp EQV param ON OFF OFF OFF Title null string null string Text Max 20 Labels null string null string X position 0 to 609 10 Y position 0 to 421 30 Graphic Memory trace Selection Graphic Memory trace No effect No effect Graphics Frequency Blank ON OFF OFF Display Allocation All instrument Half Half All BASIC All Instrument All Instrument BASIC status Intensity 0 to 100 No effect 83 96 Background Intensity 0 to 100 96 No effect 0 Backlight ON OFF ON ON ON User trace ON OFF OFF OFF User trace headline Maximum 12 characters USER TRACE USER TRACE 1 4 1 4 User trace footnote Maximum 34 characters null string null string Input Range and Default Setting B 3 Scale Ref Function Range Preset Value Power ON Factory default Setting Scale Coupling Coupling Uncoupling Coupling Coupling Reference Position 0 to 10 5 5 Scale top value linear scale IZ R Rp Rs X 1x10 to 1x 10 1 MQ 1 MQ Y G B 1x10 to 1x 10 1s 1s P Tx 1x10 to 1x10 1 1 Ty 1x10 to 1x 10 1 1
124. 11 04291 18000 04291 65006 04191 85300 04191 85302 04291 60042 04291 60041 16190 25011 04291 60121 04291 09001 04291 18001 1250 1859 C3757 60401 E2083 90005 5062 3991 5062 3979 5062 3985 1 Option OBW only 2 The power cable depends on where the instrument is used see Quick Start Guide 3 Option 013 and 014 only 4 Option 1D5 only 5 Option 1CN only 6 Option 1CM only 7 Option 1CP only 4291B RF Impedance Material Analyzer Technical Data 12 51 A Manual Changes Introduction This appendix contains the information required to adapt this manual to earlier versions or configurations of the analyzer than the current printing date of this manual The information in this manual applies directly to the 4291B RF Impedance Material Analyzer serial number prefix listed on the title page of this manual Manual Changes To adapt this manual to your 4291B see Table A 1 and Table A 2 and make all the manual changes listed opposite your instrument s serial number and firmware version Instruments manufactured after the printing of this manual may be different from those documented in this manual Later instrument versions will be documented in a manual changes supplement that will accompany the manual shipped with that instrument If your instrument s serial number is not listed on the title page of this manual or in Table A 1 it may be documented in a yellow MANUAL CHANGES supplement In additions to change infor
125. 12 bound with this manual High Temperature Low Impedance Test Head Option 014 only This test head is designed to measure low impedance component or material in high temperature condition The analyzer can measure components or materials in temperature range from 55 C through 200 C when this test head is used with the 16194A High temperature component fixture or the 16454A Magnetic Material Test Fixture This test head is furnished with Option 014 The dimensions of this test head and the impedance measurement accuracy using this test set is shown in the Chapter 12 bound with this manual 2 16 Front and Rear Panel Test Station and Test Heads Handling and Storage APC 7 Connectors m Keep connectors clean m Do not touch the mating plane surfaces m Do not set connectors contact end down m Before storing extend the sleeve m Use end caps over the mating plane surfaces m Never store connectors loose in a box or a drawer Microwave connectors must be handled carefully inspected before use and when not in use stored in a way that gives them maximum protection Avoid touching the connector mating plane surfaces and avoid setting the connector s contact end down on any hard surface Natural skin oils and microscopic particles of dirt are easily transferred to the connector interface and are very difficult to remove Damage to the plating and to the mating plane surface occurs readily when the interface come
126. 12 37 Typical Frequency Characteristics of Temperature Coefficient of ur and Loss Tangent Accuracy F 0 5 12 48 4291B RF Impedance Material Analyzer Technical Data Material Measurement Accuracy with High Temperature Test Head h Inc 3 nb wees Coo prz Weideldd L r 30 Hro L retogo L r 800 1080M Frequency Hz Figure 12 38 Typical Frequency Characteristics of Temperature Coefficient of ur and Loss Tangent Accuracy F 3 P hinf 4291B RF Impedance Material Analyzer Technical Data 12 49 Material Measurement Accuracy with High Temperature Test Head Bis ne i em r 1000 r 300 100M Frequency Hz Figure 12 39 Typical Frequency Characteristics of Temperature Coefficient of ur and Loss Tangent Accuracy F 10 F hing 12 50 4291B RF Impedance Material Analyzer Technical Data Furnished Accessories Furnished Accessories Accessory Agilent part number Operating Manual Quick Start Guide Programming Manual Service Manuall Program Disk Set Power Cable 50 Q Termination 0 Q Termination 0 S Termination Low Loss Capacitor Calibration Kit Carrying Case APC 7 End Cap Fixture Stand Pad Temperature Coefficient Measurement Program Disk BNC Adapter mini DIN Keyboard HP Instrument BASIC Users Handbook Handle Kit Rack Mount Kit Rack Mount and Handle Kit 04291 90020 04291 90021 04291 90027 04291 901
127. 2 84 MHz 514 645 MHz 686 19333 MHz 1029 29 MHz 1327 38666 MHz See EMC under Others in General Characteristics 12 6 4291B RF Impedance Material Analyzer Technical Data Permeability Measurements Test head High Impedance Number of averaging on point 8 OSC level 0 12V Voscz0 02V COb0000 LS 104 A x SS 10M EN 00m Ba Frequency Hz Figure 12 2 Impedance Measurement Accuracy Using High Impedance Test Head Low OSC Level 100 Test head High Impedance Number of averaging on point 8 OSC level 1VzVoscz0 12V C6600004 tom 10M 2 DS 2 Frequency Hz Figure 12 3 Impedance Measurement Accuracy Using High Impedance Test Head High OSC Level 4291B RF Impedance Material Analyzer Technical Data 12 7 Permeability Measurements Test head Low Impedance Number of averaging on point 8 OSC level 0 12V Voscz0 02V 10M KON 100M BD Frequency Hz C6600007 Figure 12 4 Impedance Measurement Accuracy Using Low Impedance Test Head Low OSC Level S Dn of 10H 100Kpum Test head Low Impedance Number of averaging on point 8 OSC level 1V2 Voscz0 12V 1M L 10M PS OK Frequency Hz C6600008 Figure 12 5 Impedance Measurement Accuracy Using Low Impedance Test Head High OSC
128. 20007E 1 4 09729E 1 1 52238E 7 9 32143E 1 4 1914E 2 4 5 1 This is the date when the file is saved 2 This line is listed when the title is defined displayed 3 Shows the power level of the source for a frequency sweep If power sweep is selected the CW frequency is listed for example CW FREQ 100 MHz 4 means tab code Data is separated by the tab code 5 This line lists the names of the data array saved in this file Titles used in the ASCII files are shown in Table 8 3 6 Each line lists the measurement data at each measurement point The number of lines in the data block is the same as the number of points Instrument State Block 8 57 Saving and Recalling File Structure for Single Channel and Dual Channel If you save an ASCII file when DUAL CHANNEL is turned OFF the active channel s data If DUAL CHANNEL is turned ON the ASCII data file consists of the data of both channels 1 and 2 The channel 2 data follows the channel 1 data the ASCII data file consists of as follows File Structures for Single and Dual Channels Dual Channel OFF Dual Channel ON Status Block Status Block Data Block of Active Channel Data Block of Channel 1 end of file Status Block Data Block of Channel 2 Table 8 3 Data Groups and Data Array Names Data Groups Data Array Names Descriptions Real Part Imaginary Part
129. 2zfC R Cp Os Q 1 D 1 D Rp p2 Le 2nfL 1 1 L po D 2r f Lp Ll Ls Lp AW Rp Q 1 D Rp Dp Rs 1 p Rp Ls Rs L T p Fs _1 Lp 1 DAL 2rfLs Q 1 D Rp p Selecting Circuit Mode of Capacitance The following description gives some practical guide lines for selecting the capacitance measurement circuit mode Small Capacitance Small capacitance yields a large reactance that implies that the effect of the parallel resistance Ry has relatively more significance than that of the series resistance Rs The low value of resistance represented by R has negligible significance compared with the capacitive reactance so the parallel circuit mode C5 should be used see Figure 11 3 High Z T More significant Rs ess significant Small C 3 Figure 11 3 Small Capacitance Circuit Mode Selection Impedance Measurement Basics 11 7 Series and Parallel Circuit Models Large Capacitance When the opposite is true and the measurement involves a large value of capacitance low impedance Rs has relatively more significance than R so the series circuit mode C D or C Q should be used see Figure 11 4 Large C L Rp 4 Low 2 T Less significant Rs EE ore significant Ceotlo04 Figure 11 4 Large Capacitance Circuit Mode Selection The following is a rule of thumb for selecting the circuit model according to the impedance
130. 48 display 2 4 5 33 1 5 display adjustment 5 42 display allocation 5 33 5 36 DATA MATH 5 35 DISPLAY DATA 5 33 display limit table 8 28 display list sweep table 8 28 D M 2 7 D M 2 7 D M 2 7 dual channel 5 33 dual parameter setting 5 12 edge effect 11 27 emc 12 21 END EDIT 8 7 entry block 4 1 gt 4 3 equivalent circuit 5 40 equivalent circuit model 11 6 ERASE TITLE 5 46 error message Messages 1 expanded phase ON OFF 5 30 Ext 2 7 external program run cont input 2 10 external reference 2 7 external reference input 2 9 external trigger 6 13 external trigger input 2 10 factory setting B 1 fast sweep indicator 2 7 file name 8 50 fixed cal points 5 55 fixed compensation points 5 57 fixed delta marker 7 6 FIXED AMKR AUX VALUE 7 6 FIXED AMKR VALUE 7 6 fixed Amarker 7 6 fixture compensation 5 57 5 58 5 59 fixture compensation coefficient arrays 9 5 fixture setting 5 14 fixture stand 1 3 floppy disk 12 51 floppy disk drive 2 3 footnote 5 48 format 5 30 9 6 1 4 frequency base 6 8 frequency blank 5 35 front panel 2 1 function reference 12 51 G 11 4 gain 5 39 gain 5 38 G 2 7 G jB 7 19 G n gt 4 2 GEO 2 7 GPIB 8 44 GPIB address 8 19 8 47 GPIB cable 10 5 GPIB command reference 12 51 GPIB interface 2 10 graphics 8 49 Index 5 Index 6 graphics
131. 5 MKR PEAK DELTA 7 13 MKR RIGHT RNG 7 15 MKR START 7 9 MKR STOP 7 9 MKR THRESHOLD 7 13 MKR ZOOM 7 9 Me 4 2 modify colors 5 42 modify compen kit 5 62 5 64 mounting post 2 13 mounting screw 2 13 next peak 7 14 NEXT PEAK SEANPK 7 14 NEXT PEAK LEFT SEANPKL 7 14 NEXT PEAK RIGHT SEANPKR 7 14 nominal 12 1 non volatile memory B 1 nop 6 4 notations 2 7 number of points 6 4 numeric keypad 4 2 Offset 5 38 option 001 add dc bias 10 1 option 002 add material measurement firmware 10 1 option 011 delete high impedance test head 10 1 option 012 add low impedance test head 10 1 option 013 add high temperature high impedance test head 10 1 option 014 add high temperature low impedance test head 10 1 option OBW add service manual 10 2 option 1D5 2 8 2 10 option 1D5 add high stability frequency reference 10 2 Option Keyboard less 10 2 options available 10 1 order base 6 8 osc level 6 10 outer diameter 5 29 parallel circuit model 11 6 Parallel Resistance 11 4 part number 12 51 PART SRCH on OFF 7 15 pass fail 2 5 Peak 2 5 PEAK SEAM PEAK 7 14 PEAK CENTER 7 9 peak definition 7 26 PEAK DEF MENU 7 11 peak delta 7 13 PEAK DELTA AX 7 13 PEAK DELTA AY 7 13 Peak menu 7 13 PEAK PLRIY POS neg 7 13 peak polarity 7 13 peak polarity 7 26 PEN 5 43 pen color 5 43 performance 12 1 perfo
132. 5 16 Test Station 2 2 2 2 2 2 2 Keeping Space Around the Heat Sink Dimensions of Test Station Test Heads l l lc lll rs Active Channel Keys Entry Block l l cllc Measurement Block 044 Softkey Menus Accessed from the Key for Impedance Measurement Softkey Menus Accessed from the Key for Permittivity Measurement Softkey Menus Accessed from the Key for Permeability Measurement Softkey Menus Accessed from the Key for Impedance Measurement when Smith Polar Admittance or Complex Plane Format is selected 2 a a Softkey Menus Accessed from the Key for Permittivity Measurement when Smith Polar Admittance or Complex Plane Format is selected 2 a a Softkey Menus Accessed from the Key for Permeability Measurement when Smith Polar Admittance or Complex Plane Format is selected 2 a a Impedance Measurement Menu Complex Impedance Measurement Menu Dual Parameter Menu 2 2 2 224 Impedance Fixture Menu No option 002 Impedance Fixture Menu Option 002 only Permittivity Measurement Menu Option 002 only Complex Permittivity Measurement Menu Option 002 only 2 2 s e a Dual Parameter Menu Dielectric Material Measurement a a a llle Dielectric Material Fixture Menu Option 002 only
133. 5 36 graticule on off 5 35 handle kit option 10 2 headline 5 48 heat sink 2 14 height 5 29 high impedance test head 1 2 high impedance test head delete option 10 1 high stability frequency reference add option 10 2 high temperature high impedance test head 1 3 high temperature high impedance test head add option 10 1 high temperature low impedance test head 1 3 high temperature low impedance test head add option 10 1 Hld 2 7 HP DeskJet 1200 color printer 10 4 HP DeskJet 1600CM color printer 10 4 HP DeskJet 340J color printer 10 4 HP DeskJet 505 printer 10 4 HP DeskJet 560C color printer 10 4 HP DeskJet 694C color printer 10 4 HP DeskJet 850C color printer 10 4 hp hil keyboard cable 12 51 hp instrument basic users handbook 12 51 IBASIC 5 43 I 2 7 Impedance 11 3 Parameters 11 3 impedance measurement 5 9 5 12 initialize B 1 inner diameter 5 29 instrument BASIC 8 4 Instrument data arrays 8 49 instrument state block 1 6 Instrument states and internal data arrays 8 49 intensity 5 42 internal reference output 2 10 introduction 1 1 i o port 2 10 2 11 i o port pin assignment 2 11 I V method 11 12 key Back Space 4 3 GE DO to a gt D 5 EE qo Ww N Chan 2 m 3 ct 5 lt o a m c2 f a 5 m No lt EB uh D po Do terminator key 4 2 x1 4 2 keyboard 12 51 keyboard cable 12 51 keyboard conn
134. 8 3 System Menu ee ee a e 8 4 Instrument BASIC menu 8 6 Program Menu l l lees 8 9 Memory Partition Menu 0 8 10 Clock Menu 2 2 2 25 2 2 2 2 52 8 11 Beeper Menu llle n 8 13 Limit Test Menu o 8 14 Limit Line Entry Menu 8 17 Leal o MEL 8 19 Local Menu 2 2 2 2 2 2 2 5 8 19 Contents 4 Pest es 8 21 MEL 8 22 Copy Menu lll e 0 08 eee 8 23 Print Setup Menu 8 26 Copy Limit Test Menu 02 202 8 28 Copy List Sweep Menu 8 28 Screen Menu 2l 8 29 MM 8 30 Save Menu ee a 8 32 Define Save Data Menu 8 35 Re Save File Menu 0 8484 8 36 Purge File Menu 2 8 37 Purge Yes No Menu 004 8 37 Initialize Ys No Menu 8 38 e 8 39 Recall Menu 2 2 2 25 2 2 5 2 8 39 Limit Line Concept 8 40 How Limit Lines are Entered 8 40 Turning Limit Lines and Limit Testing On and Off 8 41 Segment Entering Order 8 42 Saving the Limit Line Table 8 42 Offsetting the Stimulus or Amplitude of the Limit Lines 8 42 Supported Display Formats 8 42 Use a Sufficient Number of Points or Errors May Occur 8 42 Displaying or Printing Limit Test Data 8 42 Results of Printing
135. 8 36 Re Save File Menu Instrument State Block file name file name file name file name PREV FILES NEXT FILES STOR DEV DISK Figure 8 21 Re Save File Menu file name Updates the file previously saved with the current instrument states or data The data group to be saved is determined by the file name s extension See Saving and Recalling Instrument States and Data later in this chapter for more details about file name extensions PREV FILES Displays the previous file names in the softkey label to re save data NEXT FILES Displays the next file names in the softkey label to re save data STOR DEV Selects between the floppy disk drive and the memory disk as the storage device DISK shows the floppy disk is selected and MEMORY shows the memory disk is selected This setting does not change even when the line power is cycled or the key is pressed Purge File Menu Purge Yes No Menu Gave file name Ie mai UrLITIES Hle name Yes No Menu file name i PURGE FILE PREV FILES NEXT FILES STOR DEV DISK Figure 8 22 Purge File Menu m file name Selects the file to be purged from the disk or the memory disk m PREV FILES Displays the previous file names in the softkey label to purge file m NEXT FILES Displays the next file names in the softkey label to purge file m STOR DEV Selects between the floppy disk drive and the memory di
136. 91B RF Impedance Material Analyzer Technical Data Material Measurement Accuracy with High Temperature Test Head Frequency Hz Figure 12 35 Typical Frequency Characteristics of Temperature Coefficient of r and Loss Tangent Accuracy Thickness 1 mm 4291B RF Impedance Material Analyzer Technical Data 12 43 Material Measurement Accuracy with High Temperature Test Head Frequency Hz Figure 12 36 Typical Frequency Characteristics of Temperature Coefficient of e and Loss Tangent Accuracy Thickness 3 mm 12 44 4291B RF Impedance Material Analyzer Technical Data Material Measurement Accuracy with High Temperature Test Head Magnetic Material Measurement Accuracy with High Temperature Test Head Typical Conditions of Dielectric Material Measurement Accuracy with High Temperature Test Head m Environment temperature is within 5 C of temperature at which calibration is done and within 0 C to 40 C High Temperature Low Impedance Test Head must be used Bending cable should be smooth and the bending angle is less than 30 Cable position should be kept in the same position after calibration measurement OPEN SHORT 50 Q calibration must be done Calibration ON Measurement points are same as the calibration points Averaging on point factor must be larger than 32 at which calibration is done OSC level must be same as level at which calibration is done OSC level is less th
137. Air Capacitor 11 15 Port Extension l l 11 16 Residual Parameters in the Circuit 11 19 Characteristics of Test Fixture 2 11 20 Test Fixture Represented by the F matrix of a Two Terminal Pair Network 4 11 21 Schematic Electrode Structure of the 16458A 11 26 Material has some loss o 11 26 Edge Effect 2 2 2 2 2 5 11 27 Basic Relationship of Magnetic Flux Density Magnetic Flux and Current ll rn 11 29 Schematic Fixture Structure of 16454A 11 29 Material Has Loss l l 0 11 30 Residual Impedance of the 16454A 11 31 DC Voltage and Current Level Range Typical 12 3 Impedance Measurement Accuracy Using High Impedance Test Head Low OSC Level 12 7 Impedance Measurement Accuracy Using High Impedance Test Head O High OSC Level 12 7 Impedance Measurement Accuracy Using Low Impedance Test Head Low OSC Level 12 8 Impedance Measurement Accuracy Using Low Impedance Test Head O High OSC Level 12 8 Typical Q Measurement Accuracy when open short 50 Q low loss capaciter calibration are done 12 10 Impedance Measurement Accuracy Using High Temperature High Impedance Test Head O Low OSC Level 12 14 Impedance Measurement Accuracy Using High Temperature High Impedance Test Head High OSC Level rs 12 14 Impe
138. C level applied to the DUT Vaut and the current value of the OSC level flowing through the DUT laut are caleulated using the following equations Vaut Vose X LU Laut Vose X XL Zmeas 50 or Laut Lose X LL Rp Where Vosc Voltage setting value of the OSC level Lose Current setting value of the OSC level Zmeas Current measurement impedance value of the DUT Continuous Discrete Mode Marker values are normally continuous that is they are interpolated between measured points Alternatively they can be set to read only discrete measured points Marker on the Data Trace or on the Memory Trace AMode If both data and memory are displayed you can select which marker values apply to the data trace or the memory trace If data or memory is displayed not both the marker values apply to the trace displayed In a data math display data memory data memory or data memory the marker values apply to the trace resulting from the memory math function With the use of a delta marker a delta marker mode is available that displays both the stimulus and measurement values of the marker relative to the reference Any position on the trace or a fixed point can be designated as the delta marker The Amarker can be put on a current position of the marker If the delta reference is the fixed Amarker both its stimulus value and its magnitude value y axis value can be arbitrarily set anywhere in the display area not necessari
139. COLOR MORE RETURN MORE MORE MORE MORE CE005030 Figure 5 34 Color Adjust Menu m TINT Adjusts the hue of the chosen attribute BRIGHTNESS Adjusts the brightness of the color being modified COLOR Adjusts the degree of whiteness of the color being modified RESET COLOR Resets the color being modified to the default color Color consists of the following three parameters Tint The continuum of hues on the color wheel ranging from red through green and blue and back to red Brightness A measure of the brightness of the color Color The degree of whiteness of the color A scale from white to pure color 5 44 Measurement Block Label Menu CE005035 Display MORE T LABEL COLOR X POS LABEL Y POS LABEL CLEAR LABEL bigis Y POS LABEL NUMBER CLEAR ALL LABEL RETURN Figure 5 35 Label Menu Makes label the active function to define the label Selects the color of the label text Sets the X axis position of the label selected by NUMBER Sets the Y axis position of the label selected by NUMBER ALL LABEL Clear all label NUMBER Select the number of labels Measurement Block 5 45 Title menu 5 46 Measurement Block 26005044 SELECT LETTER SPACE BACK Display MORE TITLE CAL j C pip MODIFY LABEL
140. Calibration Concepts General Impedance Measurement Schematic However actual measurement circuits have some error terms such as stray admittance and residual impedance plus the components of the circuit also have some errors In addition the four resistances Ro in the measurement circuit do not have exactly the same impedance value In fact the impedance values calculated from the above equations do not correspond with the actual impedance value of the DUT Generally an impedance measurement circuit using two vector voltmeters is represented as shown in Figure 11 11 w OF O Measurement STIMULUS Circuit wW Figure 11 11 General Schematic for Impedance Measurement Using Two Vector Voltmeters UNKNOWN DEVICE C6011013 This general impedance measurement circuit uses two vector voltmeters These two voltmeters can measure at any two different points in a linear circuit In this case the DUT s impedance can be expressed by the measured voltage values V and Vi using a bilinear form as follows z a th 11 22 1 cr Where b are complex constants f is a ratio between V and V as follows V r 11 23 7 In general Z can be expressed using the above bilinear form whenever the measurement circuit is linear By using the measurement impedance value Lm instead of the voltage ratio 7 and modifying the equation Zx can also be expressed using the followin
141. Caution A Do not exceed the operating input power voltage and current level and signal type appropriate for the instrument being used refer to your instrument s Operation Manual Z N Electrostatic discharge ESD can damage the highly sensitive microcircuits in your instrument ESD damage is most likely to occur as the test fixtures are being connected or disconnected Protect them from ESD damage by wearing a grounding strap that provides a high resistance path to ground Alternatively ground yourself to discharge any static charge built up by touching the outer shell of any grounded instrument chassis before touching the test port connectors A RIAA BA BE EWE k ORI XE RR OO RA Ole m CORRER C E ELTI HLS lll Esa ORES 2 RB LC ES ZA WES wax E E un REM EE KDEXIOoExSdS CND OBUQAGEQ 4405TANZA4AZATY OB HROJRUERLIX EUL EG WEB RIC LAREDO TFA D iC Z7wWR AFZ ZEBSERUCHERHULCS7ESV DANA F ARR aR SITHRS AIT EME CHI ERO Elke ECAR CES EIUS UCSISSVN 4291B Safety Summary When you notice any of the unusual conditions listed below immediately terminate operation and disconnect the power cable Contact your local Agilent Technologies sales representative or authorized service company for repair of the instrument If you continue to operate without repairing the instrument there is a potential fire or shock hazard for the operator E Instrument operates abnormally WB Instrument emits abnormal noise smell smoke or a spark l
142. Compensation How to perform fixture compensation for the 16194A is shown below For a basic measurement the Open and Short compensations are required However if you use both the 16194A and the High Temperature Test Head for High Impedance or the measurement frequency is above 500 MHz the Load compensation is also required The procedures for the 16453A and 16454A are shown in the applicable Fixture Compensation section in each quick start C 4 Option 013 014 Temperature Coefficient Measurement Temperature Coefficient Measurement Short Compensation PP O O C O O O C6201026 C6201021 1 Loosen the two knobs 2 Adjust the stage and the pressure arm to fit your shorting device O O O C6201023 C6201020 3 Move the pressure arm to the outside 4 Tighten the two knobs S all wy 9 5 Place the shorting device so that it contacts both 6 Release the pressure arm so that the shorting electrodes device is held by the pressure arm Option 013 014 Temperature Coefficient Measurement C 5 Temperature Coefficient Measurement
143. DANCE Selects the impedance measurement When this softkey is selected the menu accessed from the SELECT FIXTURE softkey lists only impedance fixtures The Meas and cal keys lead only to the menus related to the impedance measurement When a fixture has been specified its label is displayed in brackets in the softkey label PERMITTVTY 16453 Selects the permittivity measurement This function doesn t set the electrical length When this softkey is selected the and keys lead only to the menus related to the permittivity measurement PERMEABILITY 16454 Selects the permeability measurement When this softkey is selected the menu accessed from the SELECT FIXTURE softkey lists only magnetic material fixtures The Meas and keys lead only to the menus related to the permeability measurement When a fixture size has been specified the size is displayed in parenthesis in the softkey label Measurement Block 5 21 Dielectric Material Measurement Dielectric Material Size Menu Option 002 only Meas pee THICKNESS DONE L MODIFIED Figure 5 17 Dielectric Material Size Menu Option 002 only m THICKNESS Sets the thickness of the dielectric material to be measured m DONE MODIFIED Completes the procedure to define material size Thickness Figure 5 18 Dielectric Material Size 5 22 Measurement Block Magnetic Material Measurement Permeability Measurement Menu Option 002
144. DIT Provides the Segment menu which is used to define or modify the segment selected using SEGMENT The segment indicated by the pointer gt at the left can be modified C DELETE Deletes the segment indicated by the pointer gt at the left o ADD Adds a new segment to be defined with the Segment menu If the list is empty a default segment is added and the Segment menu is displayed so it can be modified If the list is not empty the segment indicated by the pointer is copied and the Segment menu is displayed C CLEAR LIST Leads to the following softkeys which are used to clear the list table Stimulus Block 6 7 6 8 Stimulus Block m CLEAR LIST YES Clears the entire list NO Cancels the task and softkeys and returns to the edit list menu 1 LIST DONE Defines the frequency sweep list and softkeys and returns to the previous menu The stimulus range of a segment can not be overlapped with other segments The analyzer always sweeps from a lower frequency to a higher frequency independent of the definition of the segments Frequency Base and Order Base The result of a list sweep is displayed using one of the two display modes frequency base display mode or order base display mode m Frequency base The X axis is linearly scaled by frequency The analyzer automatically scales linearly from the sweep list When the stimulus range of a segment is discontinuous from another segment
145. E Makes sweep time the active function and leads to the following softkeys which are used to specify sweep time and set automatic sweep time O SWEEP TIME AUTO Selects the optimum fastest sweep time automatically Pressing this softkey sets the point delay time to Zero o h m s Makes manual time entry the active function Enters automatically POINT DELAY TIME Makes point delay time the active function When the point delay time is set the analyzer delays the start of the measurement for the delay time specified at each measurement point See Figure 6 4 SWEEP DELAY TIME Makes sweep delay time the active function When the sweep delay time is set the analyzer delays the start of the sweep for the delay time specified at each sweep See Figure 6 4 NUMBER of POINTS Sets the number of data points per sweep Using fewer points allows a faster sweep time but the displayed trace shows less horizontal detail Using more points gives greater data density and improved trace resolution but slows the sweep In list frequency sweep the number of points displayed is the total number of frequency points for the defined list COUPLED CH ON off Toggles channel coupling of the stimulus values With COUPLED CH ON the preset condition both channels have the same stimulus values the inactive channel takes on the stimulus values of the active channel For information on the parameters that are coupled or uncoupled by the coup
146. EARCH MAX to move the marker to the anti resonance point on the trace lt Press WIDTH off WIDTH VALUE MKRVAL 2 RETURN Press WIDTH on OFF to change it to WIDTH ON off The width value Q factor and several parameters are displayed on the screen To determine the Q value using the resonance point l 2 Press to make the marker active Press SEARCH TRK on off to change it to SEARCH TRK ON off Then press MIN to move the marker to the resonance point on the trace lt Press WIDTH OFF WIDTH VALUE MKRVAL 2 RETURN Press WIDTH on OFF to change it to WIDTH ON off The width value Q factor and several parameters are displayed on the screen To determine the Q value using the admittance chart 1 Press to make marker active Then press SMTH POLAR MENU G 3B to read conductance and susceptance assuming that the admittance circle has been displayed on the admittance chart Press SEARCH TRK on off to change it to SEARCH TRK ON off Then press Search MAX to move the marker to the point where the G value is maximum on the trace resonance point 3 Press Search WIDTH OFF WIDTH VALUE MKRVAL 2 RETURN Press WIDTH on OFF to change it to WIDTH ON off The width value Q factor and several parameters are displayed on the screen MKR VALUE MKR VALUE 2 WIDTH VALUE MKRVAL 2 C6007015 Marker Function MKR VALUE 2 Bix MKR VALUE 2 4 2 x MKR VALUE
147. ES y PURGE FILE CREATE DIRECTORY CHANGE DIRECTORY COPY FILE INITIALIZE FORMAT Dos STOR DEV DISK RETURN File Menu Purge File Menu _ Copy File Menu Initialize Yes No STOR DEV DISK CE008029 Figure 8 19 Save Menu Menu Letter Menu m STATE Specifies saving the instrument states the calibration coefficients and measurement data m DATA ONLY Displays the menu used to save data DATA ONLY does not save instrument settings such as start and stop frequencies BE CAREFUL Always make sure that you save the existing STATE if you want to use the setup again o SAVE BINARY Specifies saving the internal data arrays which are defined using the DEFINE SAVE DATA key LH SAVE ASCII Specifies saving the internal data arrays as an ASCII file The arrays saved are defined by the DEFINE SAVE DATA key O DEFINE SAVE DATA Displays the define save data menu that selects the applicable data arrays to be saved 8 32 Instrument State Block Note uy Gave DO STOR DEV Selects between the floppy disk drive and the memory disk as the storage device DISK shows the floppy disk is selected and MEMORY shows the memory disk is selected m GRAPHICS Specifies saving the graphics image on the screen as an TIFF file m 4291A STATE Saves the instrument state and the internal data arrays in the format so tha
148. FF Turns on the width search feature and calculates the center frequency of a lobe on the trace width Q and cutoff point deviation from the center stimulus value The cut off point that defines the width parameters is set using the WIDTH VALUE softkey For more information on the width parameters see Width Function in the last part of this chapter The Amarker is automatically changed to the tracking Amarker when WIDTHS is turned on When WIDTHS is ON the normal Amarker cannot be selected WIDTH VALUE Sets a measurement value of a cutoff point that defines the start and stop points for a width search The width search feature analyzes the center point and the width between the trace down from or up to the anti resonance point or resonance point and the quality factor Q for the resonator Width units are in the units of the current format c MKRVAL 2 Sets the width value to the value that equals the marker value divided by the square root of 2 2 MKRVAL 2 Sets the width value to the value that equals the marker value multiplied by the square root of 2 O MKRVAL 2 Sets the width value to the value that equals the marker value divided by 2 O FIXED VALUE Makes the width value the active function and sets the width value to the value specified by this softkey In the expanded phase mode this function searches for the two cutoff points whose values are WIDTH VALUE and WIDTH VALUE For example w
149. High temperature component fixture The 16194A is used to measure a component in wide temperature range The operating temperature range is from 55 C through 200 C The usable operating frequency is up to 2 GHz 16453A Dielectric material test fixture The 16453A is used to measure the permittivity of a dielectric material This fixture has been designed to operate specifically with the 4291B equipped with the Option 002 which provides the permittivity measurement function for dielectric material The usable operating frequency is up to 1 GHz 16454A magnetic material test fixture The 16454A is used to measure the permeability of a toroidal core This fixture has been designed to operate specifically with the 4291B equipped with the Option 002 which provides the permeably measurement function for magnetic material Two types of fixtures are included in the 16454A to provide flexibility for various material sizes 16091A Coaxial termination fixture set The 160914 is suited to the measurement of lead less material samples or small size axial lead components whose leads can be shortened Two types of fixtures are included in the fixture set to provide flexibility for various sample sizes The usable operating frequency is up to 1 GHz Options and Accessories 10 3 Accessories Available 16092A Spring clip test fixture The 16092A provides a convenient capability for easily connecting and disconnecting samples It has a usabl
150. I File 2 Status Block 2 2 c 9 Analyzer Features Introduction System Overview o Data Processing 2 2 2 Overview 2 2 4 4 4 as Data Processing Flow AD converter ADC 2222 lr Digital Filter 2 2 2 Ratio Processing Fixed Point Calibration Coefficient Arrays and User Defined Point Calibration Coefficient Arrays Calibration Coefficient Interpolation Calibration Coefficient Arrays Error Collection r Averaging 2 2 2 2 25 225 2 2 Raw Data Arrays 2 ee ee ee Port Extension llc rr Fixture Compensation Coefficient Arrays Fixed Point Fixture Compensation Coefficient Arrays and User Defined Point Fixture Compensation Coefficient Arrays llle Compensation Coefficient Interpolation Fixture Compensation Data Arrays 2 2 2 2 2 2 2 252 5 Memory Arrays 2 2 2 4 l l len Format 2 2 2 2 2 2 52 Data Math 2 2 2 2 2 Data Trace Arrays 2 2 2 2 Memory Trace Arrays l l ls n Sealing 4 lel n 10 Options and Accessories Introduction Options Available cll ns Option 001 Add de bias s s Option 002 Add material measurement
151. IES in the SAVE menu displays the softkeys used to copy files The GPIB command MMEMory COPY is also available to copy files See the Programming Manual When the format of the memory disk is different from the format of the floppy disk the copy function and the command can not be used File Types and Data Groups 8 48 Instrument State Block File Types The analyzer supports two file types binary and ASCII that are used to save data on a disk m Binary File Binary files are used to save measurement conditions and data using the SAVE function and to retrieve binary data using the RECALL function External controllers and Instrument BASIC can read measurement data from binary data files m ASCII file ASCII measurement data or screen image files can be read by commonly available IBM PC based software for data analysis or other secondary functions The RECALL function cannot read ASCII files Saving and Recalling Data Groups m Instrument States and Internal Data Arrays STATE This group consists of the instrument states that include raw calibration coefficients the data arrays and the memory arrays Binary Files Only m Internal Data Arrays DATA ONLY The internal data arrays that are stored in the analyzer s memory consist of the following six data arrays See Data Processing in Chapter 9 for complete information on each data array and their relationships Binary and ASCII Files Calibration Coefficients array
152. KING AMKR Makes the active marker a Amarker Tracking Amarker When this softkey is pressed a Amarker moves to the active marker position Then the Amarker moves with the active marker It looks as if the Amarker tracks the active marker In other words the tracking Amarker can be moved using the knob or a marker search function such as SEARCH PEAK AMODE OFF Turns off the delta marker mode Therefore the values displayed for the marker and sub marker are now absolute values AMKR STIMULUS Changes the stimulus value of the fixed Amarker Fixed Amarker stimulus values can be different for the two channels if the channel markers are uncoupled FIXED AMKR VALUE Changes the amplitude value of the fixed Amarker In a Cartesian format this is the y axis value In a polar Smith chart admittance chart or complex plane format this is the first part real part of the complex data pair It applies to a magnitude phase marker a real imaginary marker an R jX marker or a G jB marker Fixed Amarker amplitude values are always uncoupled in the two channels FIXED AMKR AUX VALUE Changes the auxiliary amplitude value of the fixed Amarker used only with a polar Smith admittance or complex plane format This is the second part imaginary part of a complex data pair It applies to a magnitude phase marker a real imaginary marker an R jX marker or a G jB marker Fixed Amarker auxiliary amplitude values are always uncoupled in the two channels Th
153. KIT Leads to the Letter menu to define a label for a new set of user defined OPEN SHORT and LOAD This label appears in the COMPEN KIT softkey label in the Calibration menu and the MODIFY label in the Compen Kit menu It is saved with the data of OPEN SHORT and LOAD O KIT DONE MODIFIED Completes the procedure to define user defined OPEN SHORT and LOAD for fixture compensation 26005047 Figure 5 49 Parameters of OPEN SHORT and LOAD for the Impedance Fixture Compensation Measurement Block 5 63 Compen Kit Menu for Permittivity Measurement Fixture COMP KIT TEFLON COMPEN KIT TEFLON USER KIT SAVE USER KIT MODIFY TEFLON i DEFINE STANDARD LOAD Er REAL er IMAG THICKNESS STD DONE DEFINED i KIT DONE MODIFIED RETURN Figure 5 50 Compen Kit Menu for Permittivity Measurement Fixture This menu can be accessed when Option 002 is installed and the 16453A is selected as the test fixture to be used m COMP KIT TEFLON Selects Teflon as the LOAD standard USER KIT Selects a cal kit model defined or modified by the user using SAVE COMPEN KIT key SAVE COMPEN KIT Stores the user modified or user defined OPEN SHORT and LOAD for fixture compensation into memory after it has been modifi
154. LE CREATE DIRECTORY CHANGE DIRECTORY COPY FIEE INIEIALIZE FORMAT DOS STOR DEV DISK RETURN STOR DEV DISK Save Menu Re Save File Menu Purge File Menu file name PURGE filename YES fil name NG file name gt PREV FILES Purge Yes No Menu NEXT FILES STOR DEV IDISK file name gt SELECT file name A LETTER fil name gt SPACE file name gt BACK PREV FILES SPACE NEXT FILES gt E STOR DEV Disk gt DONE STOR DEV Copy File Menu e DISK CANCEL INFHALIZE DISKYES NO Initialize Yes No Menu Letter Menu CE008039 8 30 Figure 8 18 Softkey Menus Accessed from the Save Keys Instrument State Block Gave Recalling Instrument BASIC program The Save and Recall keys do not access Instrument BASIC programs Instrument BASIC has its own menus that are accessed from the keyboard See the Programming Manual for more information Instrument State Block 8 31 Save Menu STATE DATA ONLY 3 SAVE BINARY SAVE ASCH DEFINE SAVE DATA STOR DEV DISK RETURN Define Save gt GRAHICS 4291A STATE RE SAVE Data Menu gt Re Save FILE BACK UP MEMO DISK FILE UTILITI
155. LIMIT or LOWER LIMIT is pressed all the segments in the table are displayed in terms of upper and lower limits even if they were defined as delta limits and middle value If you attempt to set an upper limit that is lower than the lower limit or vice versa both limits will be automatically set to the same value LOWER LIMIT Sets the lower limit value for the segment Upper and lower limits must be defined If no lower limit is required for a particular measurement force the lower limit value out of range for example 1 G DELTA LIMIT Sets the limits an equal amount above and below a specified middle value instead of setting upper and lower limits separately This is used in conjunction with MIDDLE VALUE or MARKER MIDDLE to set limits for testing a device that is specified at a particular value plus or minus an equal tolerance When DELT LIMITS or MIDDLE VALUE is pressed all the segments in the table are displayed in these terms even if they were defined as upper and lower limits MIDDLE VALUE Sets the midpoint for DELTA LIMITS It uses the entry controls to set a specified amplitude value vertically centered between the limits Instrument State Block 8 17 8 18 Note Instrument State Block uy m MKR MIDDLE Sets the midpoint for DELTA LIMITS using the marker to set the middle amplitude value of a limit segment Moves the limits so that they are automatically set an equal amount above and below the present m
156. Level 12 8 4291B RF Impedance Material Analyzer Technical Data Permeability Measurements Typical measurement accuracy when open short 50 0 low loss capaciter calibration is done Conditions m Averaging on point factor is lager than 32 at which calibration is done m Cal Points is set to USER DEF m Environment temperature is within 5 C of temperature at which calibration is done and within 13 C to 33 C Beyond this environmental temperature condition accuracy is twice as bad as specified Z Y Accuracy 2 0 cece cece eee ence neces Ea Ep O ACCURACY eee cece hh e e eh ee e ens rad ccuracy 100 rad L X B Aecuraey ee Ey Es Ey EcDe R G Accuracy 0 ccc eee eee v Ea D Accuracy EV EcQx 1 D2 tan E 100 Dx tan Ec 100 lt 1 occ cece eens d Especially Dx lt O 1 oo cence eee etn enn 4 Q Accuracy 137 Dz tan E 100 L Ec 100 1 Q2 tan E 100 Qx tan Ec 100 lt 1 10 Especially gt Qx gt 10 wo ieee cence ee Q Ec 7 Where Dx Actual D value of DUT Ea Ep are as same as Ea and Ey of the measurement accuracy when OPEN SHORT 50 Q calbration is done F Ee 0 06 0 14 x 1800 Typical F measurement frequency MHz Qx Actual Q value of DUT 17 Qx tan Ec 100 2 Ec 100 4291B RF Impedance Mate
157. N SET CLOCK NEXT FILES 256K BASIC Hp429 1 384K RAM OUTPUT BEEPER Hp4291 STOR DEV 128K BASIC MENU DISK ENTER 448K RAM 5 Hp4291 LIMIT 64K BASIC END MENU 1 Program Menu DONE y Gore LOGGING RECALL fon OFF CHANGE LINE YES ND EDI SERVICE NO ON KEY MENU LABELS TY b CANCEL d user define zu user de me System Menu Memory Partition Menu x For Information on Service Menu see Service Manual LIMIT LINE on OFF DATE LIMIT TEST DOIMMYY Y on OFF MON BEEP OFF Y DA YER COMMAND ENTRY BEEP CER y cu ENTE SELECT CANCE LETTER PASS DATE MODE SPACE FATE Mon DayYear SPARE DayMonYear ERASE RETURN EEFTURN HEE DONE EBT EA SS CANCEE LIMIT LINE Y Set Clock Menu SEAR VO SEGMENT RESET EDIT STIMULUS N CLONES uus DELETE gt E VALUE IBASIC Menu ADD MKR Al STIMULUS List Y UPPER CLEAR LIST LOWER bo YES LIMIT lt PEMA DONE MIDDLE LIMIT LINE J VALUE OFFSETS Y MER STIMULUS MIDDLE OFFSET DONE AMPLITUDE UL EEE BEEP DONE OFFSE Limit Line Entry menu ONS MARKERS AMP OFS BEEP WARN RETURN RETURN RETUR Limit Menu Beeper Menu CE008037 Figure 8 2 Softkey Menus Accessed from the System Key Instrument State Block 8 3 84 System Menu Instrument State Block Eolo iBASIC IBASIC Menu PROGRAM PROGRAM MENU gt MENU MEMORY Memory PARTITION Pertition i Menu j Clock BEEPER Menu MENU SET CLOCK E LIMIT AN Beep
158. N SHORT LOAD calibration and Low Loss air capacitor calibration The Low Loss air capacitor calibration improves the accuracy of the phase measurements OPEN SHORT LOAD Calibration 11 12 Ideal Measurement Circuit Figure 11 10 a shows the basic measurement circuits for the I V method This method uses two vector voltmeters V and V V detects the vector voltage applied to the DUT and V detects the vector current flowing through the DUT Assuming that the measurement circuit is ideal which means there is no stray admittance and no residual impedance and the impedance values of all the components in the measurement circuit are exactly correct the DUT s impedance value Z is calculated using the following equations Vo Z R V 11 19 R Ro o O Ho a Basic Circuit igh Z Test Head c Low Z Test Head Figure 11 10 Measurement Circuits for I V Method Impedance Measurement Basics Figure 11 10 b and c show the simplified measurement circuits of the high impedance test head and the low impedance test head of the analyzer The DUT s impedance value Zx is calculated using the following equations if the measurement circuit is ideal For the high impedance test head Figure 11 10 b Zx is Ro Vo ee 2 1 11 20 he FD 11 20 For the low impedance test head Figure 11 10 c Z is z Ho 11 21 LET V
159. O C6001002 Figure 1 2 Test Fixtures 7 16191A Component test fixture optional 8 16192A Component test fixture optional 9 16193A Component test fixture optional 1 2 Introduction C6001003 Figure 1 3 Material Test Fixtures for Option 002 10 16453A Dielectric material test fixture optional 11 16454A Magnetic material test fixture optional o E a o 0 EE Figure 1 4 High Temperature Test Heads and High Temperature Test Fixtures for Option 013 014 12 High temperature high impedance test head furnished with option 013 13 High temperature low impedance test head furnished with option 014 14 Fixture Stand furnished with option 013 and option 014 15 16194A High temperature component test fixture optional A For more information on options and accessories available see Y Chapter 2 and manuals furnished with each accessory Also other options and accessories are available see Chapter 10 for details Note Introduction 1 3 Analyzer features Front and Rear Panels ACTIVE CHANNEL Block 2mm ACTIVE CHANNEL mmm Chan 2 Ek ENTRY Block O O CJ Entry Bu Off Space MEASUREMENT Block 14 MEASUREMENT M
160. ONE MODIFIED Completes the procedure to define material size Inner Diameter Height Outer Diameter caoga Figure 5 24 Magnetic Material Size Measurement Block 5 29 Format Menu Note 5 30 Measurement Block uy C6005016 EIN Y AXIS LOG Y AXIS POLAR CHART SMITH CHART ADMITTANCE CHART COMPLEX PLANE PHASE UNIT DEG EXP PHASE ON off Figure 5 25 Format Menu LIN Y AXIS Displays the linear magnitude format LOG Y AXIS Displays the log scale format POLAR CHART Displays a polar chart format SMITH CHART Displays a Smith chart format ADMITTANCE CHART Displays an admittance Smith chart format COMPLEX PLANE Displays a complex plane format PHASE UNIT Selects the unit for phase measurement The unit selected is shown in brackets EXP PHASE ON off Turns the expanded phase ON or OFF When this is turned OFF the analyzer wraps the phase plot around every 180 When this is ON the analyzer avoids the wrap and displays the phase plot over 180 After change the format you should select the measurement parameter again as a right one Format User Trace Format Menu Figure 5 26 User Trace Format Menu This menu can be accessed when the user trace is turned on Y AXIS LIN Selects linear scale along the y axis LOG Selects logarithm scale along the y axis m X AXIS LIN Selects linear scale alo
161. OPEN SHORT and LOAD fixture compensations It is necessary to perform calibration measurement at the APC 70 connector of the test head If calibration is performed at the tip of the extension cable the calibration error would increase m OPEN SHORT or OPEN and SHORT compensations can not cancel the error caused by the extension cable It is the best way to perform the OPEN SHORT LOAD fixture compensation if the LOAD performance is perfectly known Fixture Compensation Fixture Compensation Actual Measuring Circuit The measuring circuit connecting a test sample to the test port that is the test fixture actually becomes part of the sample that the instrument measures In addition component electrodes or leads which should essentially be of negligibly low impedance also influence the measured sample values because of the presence of certain parasitic impedances Diverse parasitic impedances existing in the measuring circuit between the test port and the unknown device affect the measurement result These parasitic impedances are present as resistive or reactive factors in parallel or in series with the sample device Furthermore in the high frequency region the equivalent electrical length of the measuring circuit including component leads rotates the measured impedance vector as function of the test signal wavelength Let s discuss the effects that increase measurement uncertainties Residual Parameter Effects Fi
162. P WARN ON off Toggles the warning annunciator When the annunciator is oN it sounds a warning when a cautionary message is displayed Instrument State Block 8 13 Limit Test Menu LIMIT EINE ON off LIMIT TEST ON off BEEP OFF Y BEEP OFF PASS FAIL RETURN EDIT EIMI LINE T Us SEGMENT EDIT Limit Line Entry Menu DELETE ADD CLEAR LIST Y CLEAR LIST YES NG LIMIT EINE OFFSETS y STIMULUS OFFSET AMPLITUDE OFFSET MK Re AMP OFS RETURN C60080 Figure 8 9 Limit Test Menu m LIMIT LINE ON off Turns limit lines on or orr If limits have been defined and limit lines are turned on the limit lines are displayed for visual comparison of the measured data in all Cartesian formats Limit lines can be saved on disk If limit lines are defined they are always saved on disk with an instrument state Limit line table can be listed Copy function accessed from Copy key can list a limit line table Ina listing of values with limit lines on and limit test on the upper limit and lower limit are listed together with the pass or fail margin as long as other listed data allows sufficient space m LIMIT TEST ON off Turns limit testing on or OFF When limit testing is oN the data is compared with the defined limits at each measured point Limit tests occur at the end of each sweep
163. Part Figure 11 2 Vector Representation of Admittance When measuring RF impedance the reflection and or transmission coefficient parameter values are usually measured by a network analyzer or RF impedance analyzer The 4291B provides the reflection coefficient as measurement parameter The reflection coefficient is defined as Vreg P 5 Vine T jT P cos0 jsin l 0 11 14 where Vref ls voltage of the reflected wave Vinc is voltage of the incident wave The reflection coefficient value and the impedance value of the sample is interrelated each with the other by the following formulas pa 27 11 15 Ze Zo 12D AZ Z 11 16 as where Zo is characteristic impedance Impedance Measurement Basics 11 5 Series and Parallel Circuit Models Series and Parallel Circuit Models An impedance element can be represented by a simple equivalent circuit consisting of resistive and reactive elements connected in series with or in parallel with each other This representation is possible by either of the equivalent series or parallel circuits because both have identical impedances at the selected measurement frequency These values are obtained by properly selecting the value of the equivalent circuit elements The 4291B can select the model by setting the measurement parameter R X G B Cp Cs Lp or Ls using the Meas key To determine which circuit model is best
164. RST RETURN CALCULATE EGV PARAMS SIMULATE F CHRST RETURN Figure 5 32 Equivalent Circuit Menu m SELECT EQV CIRCUIT Leads to the following softkeys which are used to select the equivalent circuit See Table 5 1 Selects equivalent circuit A which is used to simulate inductors with high core loss O B Selects equivalent circuit B which is used to simulate inductors in general and resisters O Selects equivalent circuit C which is used to simulate high value resistors D Selects equivalent circuit D which is used to simulate capacitors E Selects equivalent circuit E which is used to simulate resonators CALCULATE EQV PARAMS Calculates the equivalent circuit parameters While the calculation is being performed the message Calculating EQV parameters is displayed After the calculation is completed the values of the equivalent parameters are displayed DEFINE EQV PARMS Leads to the following softkeys which are used to enter the equivalent circuit parameters O PARAMETER Ri makes R the active function in order to enter its value o Lf makes L the active function in order to enter its value 4 CO makes Co the active function in order to enter its value 0 1 makes C the active function in order to enter its value 5 40 Measurement Block Note uy bigis SIMULATE F CHRST Simulates the frequency characteristics by using the current equivalent circui
165. SEL D MEM ON off to turn to off Softkey label will change from ON off to on OFF No 2 memory trace is set to be erased when another trace is selected Press SELECT MEMORY NO 1 x1 NO 1 memory trace is selected and No 2 memory trace is not displayed If you cannot display memory traces When you cannot turn on MEMORY or DATA and MEMORY In this case check if the softkey labels of MEMORY and DATA and MEMORY are dim If they are dim no data is stored in the memory trace Press Display DEFINE TRACE DATA MEMORY to store data into the memory trace before turning on the memory trace When a memory trace selected using SELECT MEMORY NO can be displayed but other memory traces cannot be displayed In this case please check if the softkey label of SEL D MEM GN off is dim if it is dim press Display DISPLAY ALLOCATION ALL MEMORY TRACE to make all memory traces available o CLEAR MEMORY Clear all memory traces The analyzer will lose all data in the memory traces after you press this softkey If the memory traces are to be recalled you must save the data to the floppy disk or the memory disk The following operations also clear the memory traces Pressing Preset Turning the analyzer off Changing NOP Recalling data from the floppy disk or memory disk Pressing SIMULATE F CHAR in the Equivalent Circuit menu changes the data in memory trace NO 1 because the equivalen
166. T and LOAD compensation will remove errors caused by the phase shift be sure to select FIXTURE NONE before the compensation measurements are performed When you perform only one or two compensation measurements OPEN and or SHORT you should specify the applicable fixture using this menu Dielectric Material Measurement Permittivity Measurement Menu Option 002 only LOSS FACTR er LOSS TNGNT tang Master MORE 16 MAGII PHASE 62 RESIST R REACT MORE 216 gt PHASE Gy CONDUCT SUSCEPTI MORE a gt REEL COEF MAGUT I PHASE G pi REALE XE IMAGE MORE ae PRMITIVTY i i REAL eri MPEDANCE OMAAN CAPACITNCE PALCO SER CS INDUCTNCE PRLLp SER ESI MORE 5 6 7 RESISTNCE PRL Rp SERS D FACTOR Le Q FACTOR Bl MORE 6 6 DUAL PARAMETER FIXTURE 164 53 MATERIAL SIZE Dual Paramenter Menu Dielectric Material Measurement gt Dielectric Material Fixture Menu DUAL PABAMETER FIXTURE Dielectric Material Size Menu 16453 MATERIAL SIZE DUAL PARAMETER FIXTURE 16453 MATERIAL SIZE DUAL PARAMETER FIXTURE 16453 MATERIAL SIZE DUAL PARAMETER FIXTURE 16453 MATERIAL SIZE DUAL PARAMETER FIXTURE 16453 MATERIAE SIZE Figure 5 13 Permittivity Measureme
167. TART and the far right hand side of a set of limit lines will continue until the maximum stimulus value sToP A segment is placed at a specific stimulus value a single frequency for example The first segment defines the limit line value from the minimum stimulus value Once its stimulus value is entered the upper and lower test limit 5 kQ and 4 8 kQ for example need to be supplied Defining a second segment defines where the first set of limit lines ends This process is repeated to create different sets of limit lines each having new upper and lower limits Up to 18 segments can be entered Limits can be defined independently for the two channels The example in Figure 8 26 shows a combination of limit lines that change instantly and gradually Segment 1 is at 200 MHz and has an upper and lower limit of 5 and 4 8 kQ respectively Notice the upper and lower limit lines start at the START frequency 100 MHz and end at segment 1 Segment 2 is also at 200 MHz with different upper and lower limits of 5 1 kQ and 4 9 kQ changing the limit values instantly Segment 3 is at 300 MHz with the same limit value as segment 2 to obtain a flat limit line Segment 4 is at 400 MHz with upper and lower limit values of 5 2 kQ and 5 kQ changing the limit values gradually Notice the upper and lower limit lines start at the segment and continue until the sTOP frequency 500 MHz Limit lines cannot be cut When limit lines are need
168. The Al CPU s FDC Flexible Disk drive control ship does not work properly Replace the Al CPU with anew one See the Service Manual for troubleshooting File name error A legal program command or query could not be executed because the file name on the device media was in error For example an attempt was made to copy to a duplicate file name The definition of what constitutes a file name error is device specific File name not found A legal program command could not be executed because the file name on the device media was not found for example an attempt was made to read or copy a nonexistent file FLOPPY DISK DRIVE FAILURE FOUND An external test 18 DSK DR FAULT ISOL N fails The A53 built in FDD floppy disk drive does not work properly Replace the A53 FDD with a new one See the Service Manual for troubleshooting FRACTIONAL N OSC TEST FAILED An internal test 7 Ab FRACTIONAL N OSC fails The fractional N oscillator on the A5 synthesizer does not work properly See the Service Manual for troubleshooting FREQUENCY SWEEP ONLY Equivalent circuit function is executed in OSC level sweep DC I sweep DC V sweep The equivalent circuit function is available in frequency sweep only FREQUENCY SWEEP ONLY Cannot select MKR X AXIS L1 27F in OSC level sweep or DC V DC I sweep Messages 7 Temperature Coefficient Measurement Messages 8 238 240 241 248 249 237 FRONT ISOL N TEST FAILED
169. URN Screen Menu Figure 8 15 Copy Limit Test Menu m DISPLAY LIST Displays the limit testing table and the Screen menu to prepare for hard copy m DISP MODE UPR amp LWR Selects the upper and lower formats that display the upper limit and lower limit values m MID amp DLT Selects the middle and delta formats that display the middle value and the maximum deviation limit value from the middle value Copy List Sweep Menu Copy Y MORE Y LIST SWEEP TABLE CE008027 DISPLAY LIST DISP MODE ST amp SP CTR amp SPAN RETURN Screen Menu Figure 8 16 Copy List Sweep Menu m DISPLAY LIST Displays the list sweep table and leads to the Screen menu to prepare for hard copy m DISP MODE ST amp SP Selects the start stop format to list the sweep parameter m CIR amp SPAN Selects the center span format to list the sweep parameter 8 28 Instrument State Block Screen Menu LIST VALUE OPERATION PARAMETERS Cony CAL KIT DEFINITION PRINT STANDARD COPY ABORT COPY TIMI COMPEN KIT DEFINITION E on OFF NEXT PAGE LIMIT SWEEP TABLE COPY LIST SWEEP MENU LIMIT TEST TABLE COPY LIMIT TEST MENU PREV PAGE RESTORE DISPLAY Figure 8 17 Screen Men
170. WEEP LINEARITY TEST FAILED An external test 19 POWER SWEEP LINEARITY fails See the Service Manual for troubleshooting PRINTER not on not connected out of paper The printer does not respond to control Check the supply to the printer online status sheets and so on Program currently running Certain operations dealing with programs may be illegal while the program is running For example deleting a running program might not be possible Program error A downloaded program related execution error occurred This error message is used when the analyzer cannot detect the more specific errors described for errors 281 through 289 Messages 15 Temperature Coefficient Measurement Messages 16 112 286 286 430 400 420 350 242 Program mnemonic too long The header contains more than twelve characters see IEEE 488 2 7 6 1 4 1 Program runtime error A program runtime error of the HP Instrument BASIC has occurred To get a more specific error information use the ERRM or ERRN command of the HP Instrument BASIC Program syntax error A syntax error appears in a downloaded program The syntax used when parsing the downloaded program is device specific Query DEADLOCKED A condition causing a deadlocked query error occurred see IEEE 488 2 6 3 1 7 For example both input buffer and output buffer are full and the analyzer cannot continue Query errors This is the generic
171. When a terminator is required the data entry arrow points at the last entered digit in the active entry area When the unit s terminator key is pressed the arrow is replaced by the units selected The units are abbreviated on the terminator keys as follows G n Giga nano 10 107 M p Mega micro 10 10 5 k m kilo milli 103 1073 x1 basic units dB dBm degrees seconds Hz V A F H Q or S may be used to terminate unitless entries such as averaging factor The knob adjusts the current values continuously for functions such as scale reference level and others If a marker is on and no other function is active the knob can adjust the marker position Values changed by the knob are effective immediately and require no terminator The 1 and f keys step the current value of the active function up or down The steps are predetermined and cannot be altered No unit s terminator is required with these two keys Clears and turns off the active entry area and any displayed prompts error messages or warnings Use Entry Off to clear the display before plotting This key also prevents active values from being changed by accidentally moving the knob The next function selected turns the active entry area back on Back Space Deletes the last entry or the last digit entered from the numeric keypad Entry Block 4 3 Measurement Block The measurement block keys and associat
172. ablity measurement The DONE MODIFIED key under MATERIAL SIZE is pressed or it is attempt to select the measurement parameter key when the material sizes are empty Define the material size before press these keys MAX VCXO LEVEL OUT OF SPEC Maximum VCXO level is incorrect in performing an adjustment test 36 3RD VCXO LEVEL ADJ or an adjustment test 39 SOURCE VCXO LEVEL ADJ See the Service Manual for troubleshooting MEM TRACE MEMORY FULL Another memory trace cannot be saved because the total NOP of memory traces exceeds 801 x 3 Memory error An error was detected in the analyzer s memory Missing parameter Fewer parameters were received than required for the header For example the SRE command requires one parameter so receiving only SRE is not allowed MUST BE MORE THAN 2 POINTS FOR ANALYSIS CALCULATE EQV PARAMS CALCulate EVALuate EPARameters is pressed when the NOP number of points is 2 Set the number of measurement points to the number lager than 2 Messages 11 Temperature Coefficient Measurement Messages 12 92 87 0 94 90 NO ACTIVE MARKER GPIB only The marker command cannot be execute when no marker is displayed on the screen Turn on the marker before executing the marker commands NO CALIBRATION CURRENTLY IN PROGRESS The RESUME CAL SEQUENCE softkey No GPIB command is not valid unless a calibration is in progress Start a new calibration See Ca
173. accuracy and stability This option can be retrofitted using the 4291V Option 1D5 Option 1A2 Keyboard less This option is not furnished with the mini DIN keyboard Option 1CM Rack mount kit This option is a rack mount kit containing a pair of flanges and the necessary hardware to mount the instrument with handles detached in an equipment rack with 482 6 mm 19 inches horizontal spacing Option 1CN Handle Kit This option is a rack mount kit containing a pair of handles and the necessary hardware to mount the instrument Option 1CP Rack mount and handle kit This option is a rack mount kit containing a pair of flanges and the necessary hardware to mount the instrument with handles attached in an equipment rack with 482 6 mm 19 inches horizontal spacing 10 2 Options and Accessories Accessories Available Measurement accessories available 16191A Side electrode SMD test fixture The 161914 is used to measure a side electrodes surface mount device SMD with high repeatability The usable operating frequency is up 2 GHz 16192A Parallel electrode SMD test fixture The 16192A is used to measure a parallel electrodes surface mount device SMD with high repeatability The usable operating frequency is up 2 GHz 16193A Small side electrode SMD test fixture The 16193A is used to measure a small side electrodes surface mount device SMD with high repeatability The usable operating frequency is up 2 GHz 16194A
174. acy F 0 5 2 2 2 2252252525555 12 48 Typical Frequency Characteristics of Temperature Coefficient of u and Loss Tangent Accuracy F DT 12 49 Typical Frequency Characteristics of Temperature Coefficient of u and Loss Tangent Accuracy F WO a 12 50 Serial Number Plate A 2 Equipment Setup lll len C 2 Test Head and Test Stand Setup C 3 16194A Connection o C 4 Contents 15 Tables Contents 16 NON ON ON Equivalent Circuit Selection Guide List Value Format rn Contents of ASCII Files Data Groups and Data Array Names Supported Printers and Printing Modes Parallel Series Circuit Model and Measurement Parameter 2 2 2 2 2 2 Dissipation Factor Equations and Parallel Series Equivalent Circuit Conversion s and Y when High Impedance Test Head is used s and Y when Low Impedance Test Head is used s and Y when High Impedance Test Head is used s and Y when Low Impedance Test Head is used Applicable Dielectric Material Size Using with 16453A Applicable Magnetic Material Size Using with 16454A Manual Changes by Serial Number 2 Manual Changes by Firmware Version Introduction Introduction This chapter provides an overview of the 4291B system and descriptions of the main features of the analyzer also r
175. al for troubleshooting STEP OSC TEST FAILED An internal test 8 A5 STEP OSC fails The step oscillator on the Ab synthesizer does not work properly See the Service Manual for troubleshooting String data error This error as well as errors 151 and 158 are generated when analyzing the syntax of a string data element This particular error message is used if the analyzer cannot detect a more specific error String data not allowed A string data element was encountered but was not allowed by the analyzer at this point in parsing Suffix error This error as well as errors 131 through 139 are generated when parsing a suffix This particular error message is used if the analyzer cannot detect a more specific error Suffix not allowed A suffix was encountered after a numeric element that does not allow suffixes Suffix too long The suffix contained more than 12 characters see IEEE 488 2 7 7 3 4 Syntax error An unrecognized command or data type was encountered For example a string was received when the analyzer was not expecting to receive a string System error Some error termed system error by the analyzer has occurred Too many digits The mantissa of a decimal numeric data element contains more than 255 digits excluding leading zeros see IEEE 488 2 7 7 2 4 1 56 69 223 46 70 236 236 234 Temperature Coefficient Measurement TOO MANY SEGMENTS The maxi
176. alibration Menu ss ls Fixture Compensation Menu MN Fixture Compensation Menu for Permittivity Measurement Fixture Compensation Menu for Permeability Measurement Calkit Menu 2 Calibration Standard Model Compen Kit Menu for Impedance Measurement Fixture 2 Parameters of OPEN SHORT and LOAD for the Impedance Fixture Compensation RE Compen Kit Menu for Permittivity Measurement Fixture 2 Parameters of LOAD for the Premitttivity Fixture Compensation ll leen Port Extension Menu Stimulus Block Softkey Menus Accessed from the Sweep Key Sweep Menu 2 2 2 2 52 502D02 524 Sweep Delay Time and Point Delay Time Lit Menu 2 2 2 2 2 2 Segment Menu s Softkey Menus Accessed from the Source Key Softkey Menus Accessed from the Trigger Key Marker Block a Softkey Menus Accessed from the Marker Key Marker Meda Delta Mode Menu ll cnn 5 22 5 22 5 23 5 25 5 26 5 27 5 29 5 29 5 30 5 31 5 32 5 33 5 36 5 37 5 38 5 40 5 42 5 44 5 45 5 46 5 47 5 49 5 51 5 52 5 54 5 55 5 57 5 58 5 59 5 60 5 61 5 62 5 63 5 64 5 65 5 66 6 1 6 3 6 4 6 5 6 7 6 9 6 10 6 12 7 1 7 3 7 4 7 6 1 5 1 6 7 7 7 8 1 9 1 10 7 11 1 12 1 13 1 14 1 15 8 1 8 2 8
177. alue Zm is transformed to Zx through the equation 11 45 Some assumptions are made for compensations except for OPEN SHORT LOAD fixture compensation The following paragraphs show the conditions assumed for each combination and the equations used for each combination of the OPEN SHORT and LOAD fixture compensations OPEN Compensation When only the OPEN compensation is used for the fixture compensation two additional conditions are required to solve the Zx equation One condition assumes that the equivalent circuit model of the fixture used is a symmetric circuit The other condition assumes that SHORT measurement capability is ideal that is the measurement value for perfect SHORT standard equals to perfect SHORT value These conditions are explained as follows Assuming that A D symmetric circuit 11 39 B 0 11 40 Then the compensation coefficients are Acompen 1 jO 11 41 Beompen 0 jO 11 42 Ccompen Yom Yos 11 43 Where Yom is the admittance value measured under open condition Yos is the admittance value defined as OPEN as the fixture compensation kit SHORT Compensation When only the SHORT compensation is used for the fixture compensation two additional conditions are required to solve the Z equation One condition assumes that the equivalent circuit model of the fixture used is a symmetric circuit The other condition assumes that OPEN measurement capability is ideal that is the measurement
178. alue back to the default values gain 1 offset 0 OFFSET Displays the menu used to define the offset value and activates the offset value When using Smith polar admittance chart and complex plane format OFFSET defines the real part of the offset value m MKR OFFSET Enters the marker s amplitude value into the Offset value m OFFSET Makes the offset value the active function AUX OFFSET VALUE Defines the imaginary part of the offset value when using the Smith polar admittance chart and complex plane format If the format is not one of the above formats this softkey performs no function O GAIN Defines the gain value for the data math function 5 38 Measurement Block bigis The data math functions displays the result of the following calculations Where GAIN x DATA OFFSET GAIN x MEMORY OFFSET GAIN x DATA MEMORY OFFSET GAIN x DATA MEMORY OFFSET GAIN x DATA MEMORY OFFSET GAIN x DATA x MEMORY OFFSET GAIN is a scalar value defined by GATN DATA is the data trace value measurement value MEMORY is the memory trace value stored by DATA WEMORY OFFSET is an offset value defined by OFFSET Measurement Block 5 39 Equivalent Circuit Menu SELECT EGV CKT A CALCULATE EGV PARAMS SIMULATE F CHRST RETURN DISP EQV FARM OFF DEFINE EGV PARAMS Y PARAMETER Ri et Ef co SIMULATE F CH
179. an or equal to 0 25 Vrms or greater than 0 25 Vims and frequency range is within 1 MHz to 1 GHz m Environment temperature of the main frame is within 45 C of temperature at which calibration is done and within 0 C to 40 C A i py Accuracy Elm Same as accuracy at which a normal test head rm is used Loss Tangent Accuracy of jj Atan Same as accuracy at which a normal test head is used At the following frequency points instrument spurious characteristics could occasionally cause measurement errors to exceed specified value because of instrument spurious characteristics 10 71 MHz 17 24 MHz 21 42 MHz 42 84 MHz 514 645 MHz 686 19333 MHz 1029 29 MHz 1327 38666 MHz See EMC under Others in General Characteristics The excessive vibration and shock could occasionally cause measurement errors to exceed specified value 4291B RF Impedance Material Analyzer Technical Data 12 45 Material Measurement Accuracy with High Temperature Test Head Typical Effects of Temperature Drift on Magnetic Material Measurement Accuracy When environment temperature is without 5 of temperature at which calibration is done add the following measurement error 1 Ahem ur Accuracy TT iiis Ey Eas Eb3 Hrm Eas E Loss Tangent Accuracy of ji Atan Frans Bes E Where E is j accuracy at which a normal test head is used E n u is
180. analyzer displays the sizes of the memory disk and the BASIC area instead of mm and nn m DONE Displays CHANGE YES and NO softkey to execute or cancel the change D CHANGE YES Changes the memory partition to the one selected and presets the instrument O NO Cancels the change to the memory partition and returns to the previous softkey menu When the memory partition is changed When the memory partition is changed the following settings are also changed m The analyzer setting becomes the preset state m The Instrument BASIC program in the program editor is lost m All data in the memory disk and backup of the memory disk is lost 8 10 Instrument State Block System Clock Menu TIME HH MM SS SET CLOCK HOUR MIN SEC ENTER CANCEL dM DD MM YY MON DAY YEAR ENTER CANCEL DATE MODE MonDay Year J Day MonYear RETURN Figure 8 7 Clock Menu m TIME HH MM SS Displays the current time on the active entry area and displays the next page to adjust time O HOUR Enables changing the hour setting using the knob or the numeric entry keys After you change the hour setting press ENTER to restart the clock MIN Enables changing the minute setting using the knob or the numeric entry keys After you change the minute setting press ENTER to restart the clock SEC Enables changing the second setting using the knob or
181. and displays them on the display in increasing order of stimulus values LIMIT LINE OFFSETS Displays the following three softkeys that Offset the complete limit set in either stimulus or amplitude value O STIMULUS OFFSET Adds to or subtracts an offset from the stimulus value This allows limits already defined to be used for testing in a different stimulus range Instrument State Block 8 15 O AMPLITUDE OFFSET Adds or subtracts an offset in amplitude value This allows previously defined limits to be used at a different power level Cl MKR AMP DFS Move the limits so that they are centered an equal amount above and below the marker at that stimulus value Note a For information on the limit line concept see Limit Line Concept Y later in this chapter 8 16 Instrument State Block Limit Line Entry Menu System STIMULUS LIMIT VAHE MENU STIMULUS UPPER EDIT LIMIT LIMIT LINE LOWER LIMIT DELTA LIMIT MIDDLE VALUE MKR MIDDLE DONE Figure 8 10 Limit Line Entry Menu STIMULUS VALUE Sets the starting stimulus value of a segment using the entry block controls MKR STIMULUS Changes the segment stimulus value to the present marker stimulus value UPPER LIMIT Sets the upper limit value for the segment Upper and lower limits must be defined If no upper limit is required for a particular measurement force the upper limit value out of range for example 1 G When UPPER
182. arker amplitude value m DONE Terminates a limit segment definition and returns to the last menu For information on the limit line concept see Limit Line Concept later in this chapter This key performs the following functions m Returns front panel control to the user The analyzer ignores all front panel keys except the local key when under the control of an external computer The analyzer is in local mode when the user has front panel control The analyzer is in the remote mode when an external computer controls the analyzer m Gives access to the GPIB menu that sets the controller mode and to the address menu where the GPIB addresses of the analyzer and peripheral devices are entered Only one active controller can control the bus in a multiple controller system The controller mode determines which device is system controller and which acts as the master controller and can regain active control at any time in a multiple controller system Local Menu SYSTEM ONTROLLER ADDRESS ABLE ONLY SET ADDRESSES ADDRESS 4291 ADDRESS ONTROLLER RETURN CE008010 Figure 8 11 Local Menu m SYSTEM CONTROLLER Sets the analyzer as the system controller This mode is used when peripheral devices are to be used and there is no external controller This mode can only be selected manually from the analyzer s
183. as a handler on a production line For more information on I O port see I O Port This is input for the main power cable Insert the main power cable plug only into a socket outlet that has a protective ground contact Connects the analyzer to an external controller and other instruments in an automated system This connector is also used when the analyzer itself is the controller of compatible peripherals See GPIB in Chapter 8 7 mini DIN Keyboard Connector 8 External Trigger Input Connects the keyboard that is usually used with HP Instrument BASIC Triggers a measurement sweep The positive or negative edge of a pulse more than 20 us wide in the Low or HIGH state starts a measurement The signal is TTL compatible To use this connector set the trigger mode to external using softkey functions see Trigger in Chapter 6 9 Reference Oven Output Option 1D5 Only 10 Video Port 11 Printer Port Connects to the EXT REF INPUT connector when option 1D5 is installed Option 1D5 improves the frequency accuracy and stability of the analyzer This terminal outputs measurement results to an external color monitor Color monitors supporting VGA scan speed of 31 5 kHz can be connected to this terminal This interface enables the output of displayed results to a printer It complies with the Centronics parallel interface standard See Printer in Chapter 10 for supported printers 2 10 Front and Rear Panel Test
184. asionally cause measurement errors to exceed specified value 4291B RF Impedance Material Analyzer Technical Data 12 13 Option 013 and 014 High Temperature Test Heads Test head High Temperature High Impedance Number of averaging on point 8 OSC level 0 12V7 Voscz0 02V gt a 10M EN 100M Ga Frequency Hz C6600047 Figure 12 7 Impedance Measurement Accuracy Using High Temperature High Impedance Test Head Q Low OSC Level s La 1042 100K Test head High Temperature High Impedance Number of averaging on point 8 OSC level 1V 7 Vosc 012V Z 100M a Frequency Hz C6600037 Figure 12 8 Impedance Measurement Accuracy Using High Temperature High Impedance Test Head Q High OSC Level 12 14 4291B RF Impedance Material Analyzer Technical Data Option 013 and 014 High Temperature Test Heads Test head High Temperature Low Impedance Number of averaging on point 8 OSC level 0 12V Voscz0 02V gt x 10M EN 100M Ga Frequency Hz C6600048 Figure 12 9 Impedance Measurement Accuracy Using High Temperature Low Impedance Test Head Q Low OSC Level Test head High Temperature Low Impedance K Number of averaging on point 8 Om OSC level 1V 7 Vosc gt 012V a oom Frequency Hz C6600038 Figure 12 10 Impedance Measurement Accuracy U
185. asurement software Error Messages Error messages lists all error messages with an explanations for each error Contents Introduction Introduction 2 24 5 5 24 1 1 System Overview l l eee 1 2 Analyzer features 2 2 2 25 2 2 1 4 Front and Rear Panels 1 4 ACTIVE CHANNEL Block c 1 4 ENTRY Block 2 2 2 1 4 MEASUREMENT Block 1 4 STIMULUS Block s cll rn 1 5 MARKER Block a 1 5 INSTRUMENT STATE Block 1 6 Front and Rear Panel Test Station and Test Heads Front Panel 2 2 2 2 2 2 5 2 4 2 1 1 Front Panel Keys and Softkeys 2 2 Softkeys that are Joined by Vertical Lines 2 2 Softkeys That Toggle On or Off 2 2 Softkeys that Show Status Indications in Brackets 2 2 2 GPIB REMOTE Indicator 2 8 3 Preset a llle 2 3 4 Test Station Connectors 2 3 5 Floppy Disk Drive 2 3 6 LINE Switch ssa 2 3 Screen display oa a a a 2 4 l Active Channel 2 4 2 Measured parameter 0 2 2 48 2 5 9 Seale Div eae 2 5 4 Reference Level 1 2 5 5 Marker Data Readout 2 2 5 6 Level Monitor Marker Statistics and Width Value 2 b 7 Softkey Labels 2 5 8 Pass Fail esses a 2 5 9 DC BIAS ON notation 2 6 10 DC Bias Leve
186. ata Arrays File for ASCII File Numerical data and strings in an ASCII data file are separated by a tab and a string is bound by double quotation marks An ASCII data file consists of a status block and data blocks 8 56 Instrument State Block Status Block The status block consists of two lines the revision number and the date code Data Block The data block consists of three parts the state part the title line and the data part m State The state part consists of the following instrument states Channel number Title on the screen Measurement parameter Number of points Sweep delay time Point delay time Sweep time Sweep type Point average Source power or CW frequency dc bias m Title The title part consists of the data array names saved Data array names are described in the next section m Data The data part consists of sweep parameter and numerical data of data arrays Table 8 2 shows an example of an ASCII data file Saving and Recalling Table 8 2 Contents of ASCII Files Block Names Contents Status Block 4291B REV1 00 DATE Dec 01 1997 l State CHANNEL 1 TITLE This is a title MEASURE PARAMETER IMPEDANCE MAG NUMBER of POINTS 201 Data Block SWEEP DELAY TIME 62 5 us POINT DELAY TIME 325 us SWEEP TYPE LIST FREQ POINT AVERAGE OFF OSC LEVEL 500 mV DC BIAS OFF Title Frequency Raw Real Raw Imag Data 3 00000E 5 8
187. ation along with all other current analyzer settings Limit line table information can be saved on a disk Offsetting the Stimulus or Amplitude of the Limit Lines All limit line entries can be offset in either stimulus or amplitude values The offset affects all segments simultaneously Supported Display Formats Limit lines are displayed only in Cartesian format In polar and Smith chart formats limit testing of one value is available The value tested depends on the marker mode and is the magnitude or the first value in a complex pair The message NO LIMIT LINES DISPLAYED is shown on the display in polar and Smith formats Use a Sufficient Number of Points or Errors May Occur Limits are checked only at the actual measured data points If you do not select a sufficient number of points it is possible for a device to be out of specification without a limit test failure indication To avoid this be sure to specify a high enough number of points In addition if specific stimulus points must be checked use the list sweep features described in Sweep in Chapter 6 so that the actual measured data points are checked Displaying or Printing Limit Test Data The list values feature in the copy menu prints or displays a table with each measured stimulus value The table includes limit line and limit test information if these functions are turned on If limit testing is on an asterisk x is listed next to any measured value
188. atus file In this example setup A is saved using the name ZTF 1 Insert the data diskette DOS formatted into the floppy disk drive slot 2 Press Save STATE 3 Enter the file name ZTF and press Retum 4 The message of SAVING ZTF STA TO DISK is displayed The analyzer saves a status file with a STA extension C 8 Option 013 014 Temperature Coefficient Measurement Error Messages 222 223 225 224 243 244 This section lists the error messages that are displayed on the analyzer display or transmitted by the instrument over GPIB Each error message is accompanied by an explanation and suggestions are provided to help in solving the problem Where applicable references are provided to the related chapter of the appropriate manual The messages are listed in alphabetical order In the explanation of many error commands section numbers of the IEEE standard 488 2 are included Refer to them for further information about an error with these IEEE section numbers 1st LO OSC TEST FAILED An internal test 9 A4A1 1ST LO OSC fails The 1st LO OSC first local oscillator on the A4A1 Ist LO does not work properly See the Service Manual for troubleshooting 2nd LO OSC TEST FAILED An internal test 10 A3A2 ZND LO fails The 2nd LO OSC second local oscillator on the A3A2 2nd LO does not work properly See the Service Manual for troubleshooting 3rd LO OSC TEST FAILED An inter
189. ay of data Two different sets of data can be measured simultaneously for example one measurement with two different frequency spans The data can be displayed separately or simultaneously ACTIVE CHANNEL IA Chan 1 Chan 2 O O CE003001 Figure 3 1 Active Channel Keys Active Channel Block 3 1 Gani and Gans Active Channel Coupling Channels 3 2 Active Channel Block The Chan 1 and Chan 2 keys select which channel is the active channel This is the channel currently controlled by the front panel keys The active channel trace and data annotations are displayed on the display All the channel specific functions that are selected apply to the active channel The current active channel is indicated by an amber LED adjacent to the corresponding channel key The analyzer has dual trace capability so that both the active and inactive channel traces can be displayed either overlaid or on separate graticules split display The dual channel and split display features are available in the display menus Stimulus Coupling The stimulus values can be coupled or uncoupled between the two channels independent of the dual channel and split display functions See Sweep Menu in Chapter 6 for a listing of the stimulus value that are coupled in the channel couple mode Marker Coupling Another coupling capability is coupled markers The measurement markers can have the same stimulus values for the two chan
190. aying statistical values of the display trace indicating the time elapsed since the sweep started monitoring OSC or dc bias level applied to a DUT Introduction 1 5 For more information see Chapter 7 INSTRUMENT STATE Block This block provides control of channel independent system functions These include the controller modes real time clock limit line and limit testing HP Instrument BASIC printing saving instrument states and trace data to a built in disk or memory INSTRUMENT STATE MEE Q Rmt System ae Preset Provides access to a series of menus used for programming HP Instrument BASIC controlling the real time clock and the beeper defining the limit line table performing limit line testing and change memory size for HP Instrument BASIC and the memory disk Copy j Savo Recall Returns front panel control to the user from an external controller and displays a series of menus used to select the GPIB mode and modify the GPIB addresses Sets the analyzer to the preset state See Appendix B for a listing of the preset values Copy Provides access to the menus used for controlling external printers and defining the parameters Save Provides access to the menus used for saving the instrument state and data to the floppy disk or memory disk Displays the menu used to recall the contents of disk files or memory disk back into the analyzer For more information
191. ble for the 16192A 16193 Sets the electrical length that is suitable for the 16193A 16194 Sets the electrical length that is suitable for the 16194A USER Sets the electrical length that is a user defined value SAVE USER FXTR Saves extension value and label as a user defined fixture MODIFY Leads to the following softkeys which are used to define the electrical length and label of a selected fixture m DEFINE EXTENSION Makes the extension value of the selected fixture the active function to define extension value m LABEL FIXTURE Makes the fixture label name the active function to define it m KIT DONE MODIFIED Completes the procedure to define the selected fixture 5 14 Measurement Block Impedance Fixture Menu Option 002 only FIXTURE SELECT INONE FIXTURE Impedance Measurement IMPEDANCE INONE PERMITTIVITY 16453 PERMEABITY 116454 8 SELECT FXITURE p FIXTURE NONE 16191 16192 16193 16194 USER RETURN SAVE USER FXTR KIT MODIFY INONE DEFINE EXTENSION LABEL FIXTURE KIT DONE MODIFIED RETURN Figure 5 12 Impedance Fixture Menu Option 002 only This section describes the softkeys that can be accessed when Option 002 Material Measurement is installed and IMPEDANCE is selected in this menu m IMPEDANCE Selects the impedance measurement When this softkey is sel
192. ble position should be kept in the same dposition after calibration measurement m OSC level must be same as level at which calibration is done m OSC level is less than or equal to 0 25 V or OSC level is greater than 0 25 V and frequency range is within 1 MHz to 1 GHz Z Accuracy sesssssssssssss E Ep L Ea E 6 ACCUPACY coco t 100 rad Where E4 depends on measurement frequency as follows 1 MHz lt frequency lt 100 MHz 500 MHz lt frequency 1 GHz 1 GHz lt frequency lt 1 8 GHz Ep Zs Zx Yo Zx x100 96 0 100 MHz lt frequency lt 500 MHz 0 1 3 Zs and Yo depend on number of point averaging Nav and OSC level Vosc as follows Zx Impedance measurement value Q 12 12 4291B RF Impedance Material Analyzer Technical Data Option 013 and 014 High Temperature Test Heads Table 12 3 Z and Y when High Impedance Test Head is used Measurement Conditions Number of Point Zs 9 Yo S Averaging OSC Signal Level Nav Vos Vosc 0 02 To x 0 2 0 001 x fuma EZ x Bx 10 2x 10 xfimuHz 1 Na 7 T 5 7 oes 0 02 V lt Vose lt 0 12 0 240 001 xfiMHz Bx10 54 2x10 7 x frr 0 12 V Vose 0 2 0 001 x frm 3x 107 2x 107 xf 117 Vosc lt 0 02 TEZ x 0 140 001 x fpr PEZ x 2x 10 2x 10
193. capability the analyzer cannot display Instrument BASIC graphics when this softkey is selected bigis ERN A Instrument Area Instrument Area lt 62 colums gt Print Out Area Display Line Keyboad Input Line System Display Line RUN LIGHT RUN LIGHT ALL INSTRUMENT HALF INSTR HALF BASIC ZEE L m 62 colums gt 24 lines Print Out Area Instrument Area Display Line Display Line Keyboad Input Line Keyboad Input Line System Display Line System Display Line RUN LIGHT RUN LIGHT ALL BASIC BASIC STATUS C960C001 Figure 5 30 Display Allocations Measurement Block 5 37 Data Math Menu Display BATA MATH DATA DATA MATH DATA MEM DATA MEM DATA MEM DATAXMEM GAIN OFFSET MENU DEFAULT GAIN amp OFS OFFSET MKR gt OFFSET OFFSET AUX OFFSET RETURN GAIN BETURN d RETURN d Figure 5 31 Data Math Menu m DATA Turns off all data math functions E DATA MEM Adds the memory trace to the data trace m DATA MEM Subtracts the memory trace from the data trace DATA MEM Divides the data trace by the memory trace DATA MEM Multiplies the data trace by the memory trace GAIN OFFST MENU Leads to the following softkeys which are used to set gain and offset values for the data math function O DEFAULT GAIN amp OFS Returns gain and offset v
194. ccessed from the key in the MARKER block See Utility in Chapter 7 Source level value entered is not equal to the value applied to the DUT For example the OSC level voltage value displayed or entered is twice the value when terminating with 502 In other words the OSC level displayed is approximately equal to the value when the terminal is open When the DUT is connected to the test terminal the voltage dropped by the DUT s impedance causes the voltage value applied the DUT to be less than the OSC level setting Rs Rs Rs 500 V500 V OPEN Zx Vx 0 Vose 2 XV 500 Vosc Vopen Vose Vx Definition of the OSC Level The definitions of the OSC level are as follows m OSC voltage level Vosc Vosc is twice as large as the voltage value when terminating with 500 approximately same as open voltage m OSC current level Iosc Iosc is twice as large as the current value when terminating with 500 approximately same as short current m OSC power level Posc Posc is as the same as the power level when terminating with 500 Rs Rs Rs 500 a 500 ES 500 gt Pose Voltage Level Vos 2XVso Current Level lose 2xIso Power Level Pose P 50 Stimulus Block 6 11 CE006006 6 12 Stimulus Block Trigger Menu SWEEP HOLD SINGLE NUMBER of GROUPS
195. cified bandwidth These parameters depend on the Amarker mode The following table shows how each parameter is determined for each Amarker mode Marker Function Parameter Tracking AMarker Fixed AMarker bandwidth Displays the bandwidth value between the cutoff points set by WIDTH VALUE Center Displays the center stimulus value Displays the stimulus value between the cutoff points this is difference between the center marked by sub marker 1 stimulus value of the cutoff points and the fixed Amarker This is marked by sub marker 1 Q Displays the Q value cent BW of the trace Peak Displays the amplitude value at Displays the amplitude value the peak of the lobe difference between the amplitude value at the peak of the lobe and the amplitude value of the fixed Amarker AF left Displays the stimulus value Displays the stimulus value difference between marker 2 and difference between marker 2 and the center frequency specified by the fixed Amarker the key AF right Displays the stimulus value Displays the stimulus value difference between marker 3 and difference between marker 3 and center frequency specified by the the fixed Amarker key Figure 7 18 shows an example of the bandwidth search feature Peak Width VAL A Maker Tracking AMaker C6007014 3 Value Center i 1 i 1 i 1 i 1 i 1 i 1 2 i 1 Le Center
196. ckness 0 to 1x106 m not effect not effect 800x 1076 m ca 0 Function Range Preset Value Power ON Factory default Setting Material size for 16454A small Inner diameter 3 04 mm to 9 mm invalid invalid Outer Diameter 3 04 mm to 9 mm invalid invalid Height 0 01 mm to 3 65 mm invalid invalid Material size for 16454A large Inner diameter 3 mm to 21 mm invalid invalid Outer Diameter 3 mm to 21 mm invalid invalid Height 0 01 mm to 11 6 mm invalid invalid Input Range and Default Setting B 7 Sweep Source Trigger Function Range Preset Value Power ON Factory default Setting Delay time 0 to 3600 s 0 ms 0 ms Trigger delay time 0 to 3600 s 0 ms 0 ms Number of points 2 to 801 201 201 Coupled channel ON OFF ON ON Sweep source Freq OSC level DC V DC I Frequency Frequency Sweep type Linear Log List Linear Linear List table empty empty List segment Ot ol5 0 0 Sweep direction UP DOWN UP UP m Function Range Preset Value Power ON Factory default Setting Osc level 0 2 mV to 1 V 0 5 V 0 5 V Osc level unit Voltage dBm Ampere Volt Volt CW Frequency 1 MHz to 1 8 GHz 500 MHz 500 MHz DC BIAS ON OFF OFF OFF Voltage 40 V to 40 V OV OV Current 100 mA to 100 mA OA OA Voltage limit 1V to 40 V 1V 1V Current limit 2 mA to 100 mA 2 mA 2 mA DC BIAS source I constant V co
197. compensation 3 LOAD Measures LOAD standard for the fixture compensation 3 COMP POINT Toggles between FIXED and USER DEFINED to select the fixture compensation measurement points When FIXED is displayed the analyzer performs fixture compensation measurements on points fixed across the full frequency sweep range and the effective value for the points between these measured points will be calculated using the interpolation method When USER is displayed the analyzer performs fixture compensation measurements on the same points as the current stimulus setting D DONE COMPEN Completes the fixture compensation and then computes and stores the error coefficients m RESUME COMP SEQ Eliminates the need to restart a fixture compensation sequence that was interrupted to access some other menu Goes back to the point where the fixture compensation sequence was interrupted m OPEN ON off Turns OPEN fixture compensation ON or OFF SHORT ON off Turns SHORT fixture compensation ON Or OFF LOAD ON off Turns LOAD fixture compensation ON Or OFF Measurement Block 5 57 Fixture Compensation Menu for Permittivity Measurement Cal 0 COMPEN gt MENU FIXTURE 3 OPEN COMPEN SHORT LOAD COMP POINT FIXED DONE COMPEN RESUME COMP SEQ XL RETURN Figure 5 44 Fixture Compensation Menu for Permittivity Measurement This menu can be accessed when Option 002 is ins
198. consider the relative impedance magnitude of the reactance and R and Rp Table 11 1 Parallel Series Circuit Model and Measurement Parameter Parallel Circuit Model Series Circuit Model i Cs Rs M Rr LA is Rs AM Rp G R x ANY B Parallel Series Equivalent Circuit Conversion 11 6 Impedance Measurement Basics Parameter values for a component measured in a parallel equivalent circuit and that measured in a series equivalent circuit are different from each other The difference in measured values is related to the loss factor of the sample to be measured If no series resistance or parallel conductance is present the two equivalent circuits are identical However the sample value measured in a parallel measurement circuit can be correlated with that of a series circuit by a simple conversion formula that considers the effect of the dissipation factor D See Table 11 2 The dissipation factor of a component always has the same value at a given frequency for both parallel and series equivalent circuits Series and Parallel Circuit Models Table 11 2 Dissipation Factor Equations and Parallel Series Equivalent Circuit Conversion Device Circuit Mode Dissipation Factor Conversion to other modes Cr 11 C 4 gt D 1 _1 C 1 D Cp iM 2r f Cy Ry Q Rr Dp FO Te pe Cs Rs HEMA 1 1 o D
199. controller or the HP Instrument BASIC capability through the GPIB Appendix B in this manual Appendix C in this manual GPIB Command Reference in the Programming Manual Programming Manual Instrument State Block System System BASIC Step SESGHAM Continue System MENU GAK RAM Run file name 448K BASIC Pause MEMORY TEK RAM Stop PARTITION PREV FILES 384K BASIC Edit N 256K RAM ASSIG
200. ct No effect 17 Address controller 0 to 30 No effect No effect 21 copy Function Range Preset Value Power ON Factory default Setting Print mode Standard Color Standard Standard Copy time ON OFF OFF OFF Print color Fixed Variable Fixed Fixed Print softkey ON OFF OFF OFF OFF Print resolution 75 to 600 75 75 75 Print margin Left 0to 5 1 0 1 0 1 0 Print margin Top 0to 5 1 0 1 0 1 0 Formfeed ON OFF ON ON ON Orientation Portrait Landscape Portrait Portrait Portrait Limit table display mode Upper amp Lower Middle amp Delt Upper amp Lower Upper amp Lower List table display mode Start amp Stop Center amp Span Start amp Stop Start amp Stop E Function Range Preset Value Power ON Factory default Setting Save data definition Raw Cal Data Memory Data trace Data trace Data trace Memory trace Memory trace Memory trace Store device Disk Memory No effect No effect Disk Initialize disk format LIF DOS No effect No effect LIF B 12 Input Range and Default Setting Option 013 014 Temperature Coefficient Measurement N Introduction Warning Agilent Technologies provides a high temperature test head and a high temperature fixture to achieve an efficient and highly reliable method for evaluating temperature characteristics The other features are as follows m High Temperature Test Head that can be used within the range of 55 C to 200 C maintaining high accuracy m High Temperature Test Fixture that si
201. cy thickness 0 8mm 12 30 Typical Permittivity Measurement Accuracy e v s Frequency thickness lmm 12 30 Typical Permittivity Measurement Accuracy e v s Frequency thickness 3mm 12 31 Typical Permeability Measurement Accuracy QF 0 5 12 31 Typical Permeability Measurement Accuracy QF 3 12 32 Typical Permeability Measurement Accuracy QF 10 12 32 Typical Permeability Loss Tangent tan Measurement Accuracy F 0 5 0 0 0 00004 12 33 Typical Permeability Loss Tangent tan Measurement Accuracy QF 3 12 34 Typical Permeability loss Tangent tan Measurement Accuracy F 10 12 35 Typical Permeability Measurement Accuracy jr v s Frequency F 0 5 12 36 Typical Permeability Measurement Accuracy jr v s Frequency QF 3 12 36 Typical Permeability Measurement Accuracy jr v s Frequency QF 10 12 37 Typical Frequency Characteristics of Temperature Coefficient of and Loss Tangent Accuracy Thickness 0 8 mm aoa a a 12 42 Typical Frequency Characteristics of Temperature Coefficient of e and Loss Tangent Accuracy Thickness 1mm 12 43 Typical Frequency Characteristics of Temperature Coefficient of e and Loss Tangent Accuracy Thickness 3 mm 12 44 Typical Frequency Characteristics of Temperature Coefficient of u and Loss Tangent Accur
202. d Undefined header The header is syntactically correct but it is undefined for the analyzer For example XYZ is not defined for the analyzer Messages 19 Temperature Coefficient Measurement Messages 20 158 76 246 UNIT STRING TOO LONG GPIB only DISPlay WINDow TRACe 18 21 X UNIT lt string gt or DISPlay WINDow TRACe 18 21 Y UNIT lt string gt commands can send lt string gt up to 4 characters UNKNOWN TEST HEAD CONNECTED The test head get wrong Contact your nearest Agilent Technologies Office VCXO TUNING VOLTAGE OUT OF LIMIT VCXO tuning voltage is incorrect in performing an adjustment test 36 3RD VCXO LEVEL ADJ or an adjustment test 39 SOURCE VCXO LEVEL ADJ See the Service Manual for troubleshooting Index Special characters AL F 7 22 AR F 7 22 Amode 7 21 AX 7 26 AY 7 26 2 7 1 4 2 1 4 2 0 2 7 T 2 7 x1 4 2 10833A GPIB cable 1 m 10 5 10833B GPIB cable 2 m 10 5 10833C GPIB cable 3 m 10 5 10833D GPIB cable 0 5 m 10 5 16091A coaxial termination fixture set 10 3 160924 spring clip test fixture 10 3 16093A B binding post test fixtures 10 4 16094A probe test fixture 10 4 16191A Component test fixture 1 2 16191A side electrode SMD test fixture 10 3 16192A Component test fixture 1 2 16192A parallel electrode SMD test fixture 10 3 16193A Component test fixture 1 2 16193A small side electrode SMD test
203. d Recalling 8 52 Data Group The data file structure of each channel begins with a header and consists of the same structured data segments The number of data segments depends on the data group type as follows m RAW DATA consists of a header and four data segments per channel as shown in the following figure They will follow the file header in this order m DATA consists of a header and a data segment by a channel m DATA TRACE consists of a header and a data segment by a channel Ch 1 Ch 2 6 16xNOP 4 byte Data Group Header NOP Integer Internal Use Only 2byte 66008004 Figure 8 29 RAW DATA and DATA TRACE Data Group Structure Instrument State Block Abyte 6 16xNOP 4 byte Data Segment Data for Each Measurement Point Complex Internal Use Only 16 X NOP byte Abyte Saving and Recalling m CAL consists of data segments by a channel as shown in Figure 8 30 The first half of the segments are for channel 1 and the second half of the segments are for channel 2 The contents of each segment depend on the type of calibration performed See Cal in Chapter 5 CAL DATA Compensation Data Ch 1 Ch 1 C Comp Header Coeff Header gt Data Segment US Header Data Segment Integer Only Use Only Integen Only Use Only
204. dance Measurement Accuracy Using High Temperature Low Impedance Test Head O Low OSC Level 12 15 Impedance Measurement Accuracy Using High Temperature Low Impedance Test Head High OSC Level rs 12 15 Typical Frequency Characteristics of Temperature Coefficient Using High Temperature High Impedance Test Head 2 lll en 12 17 Typical Frequency Characteristics of Temperature Coefficient Using High Temperature Low Impedance Test Head 2 lll en 12 17 Dimensions of High Temperature Test Head 12 18 Trigger Signal 12 20 I O Port Pin Assignment a sr n 12 22 Typical Permittivity Measurement Accuracy thickness 0 8 mm 2 248 12 25 Typical Permittivity Measurement Accuracy thickness l1mm 12 25 12 18 12 19 12 20 12 21 12 22 12 23 12 24 12 25 12 26 12 27 12 28 12 29 12 30 12 31 12 32 12 33 12 34 12 35 12 36 12 37 12 38 12 39 A 1 C 1 C 2 C 3 Typical Permittivity Measurement Accuracy thickness 3mm 12 26 Typical Dielectric Loss Tangent tan Measurement Accuracy thickness 0 8mm 12 27 Typical Dielectric Loss Tangent tan Measurement Accuracy Qthickness 1 mm 12 28 Typical Dielectric Loss Tangent tan Measurement Accuracy thickness 3 mm 12 29 Typical Permittivity Measurement Accuracy e v s Frequen
205. danger of introducing additional hazards do not install substitute parts or perform unauthorized modifications to the instrument Return the instrument to a Agilent Technologies Sales and Service Office for service and repair to ensure that safety features are maintained Dangerous Procedure Warnings Warning Safety Symbols Warnings such as the example below precede potentially dangerous procedures throughout this manual Instructions contained in the warnings must be followed Dangerous voltages capable of causing death are present in this instrument Use extreme caution when handling testing and adjusting this instrument General definitions of safety symbols used on equipment or in manuals are listed below Instruction manual symbol the product is marked with this symbol when it is necessary for the user to refer to the instruction manual Alternating current NI Direct current On Supply Off Supply In position of push button switch Out position of push button switch Frame or chassis terminal connection to the frame chassis of the equipment which normally include all exposed metal structures Pho W This Warning sign denotes a hazard It calls attention arning to a procedure practice condition or the like which if not correctly performed or adhered to could result in injury or death to personnel to a procedure practice condition or the like which if not
206. dc bias sweep as the sweep mode get a stable dc bias sweep measurement result use the user defined and also you can change NOP or any other settings 6 6 Stimulus Block List Menu LIST DISP LIST FREQ BASE MENU ORDER BASE EDIT LIST Y SEGMENT EDIT Segment Menu DELETE ADD CLEAR LIST 3s CLEAR LIST YES NO RETURN Y Figure 6 5 List Menu m LIST DISP FREQ BASE Displays data measured as frequency base in the frequency list mode The frequency scale is linear across the total range Because the frequeney points may not distribute evenly across the graticule the display resolution may be uneven This causes the points to be more compressed in some parts of the trace than in other parts m ORDER BASE Displays data measured as order base in the frequency list mode The displayed frequency resolution is even across the graticule even though the frequency points are not distributed evenly For more information see the explanation of Frequency Base and Order Base on the next page m EDIT LIST Leads to the following softkeys which are used to define or modify the frequency sweep list O SEGMENT Determines a segment on the list to be modified Enter the number of a segment in the list or use the step keys to scroll the pointer gt at the left to the required segment number The indicated segment can then be edited or deleted O E
207. de must be different for each instrument on the bus See Appendix B for information on default addresses and on setting and changing addresses These addresses are not affected when you press or cycle the power Instrument State Block 8 47 Saving and Recalling Saving and Recalling Instrument States and Data Storage Devices The analyzer supports two storage devices a floppy disk drive and a memory disk The floppy disk drive is suited to storing large numbers of files and long term data storage memory disk is suited to storing tentative data and instrument states and to store or get data quickly Disk Requirements The analyzer s disk drive uses a 720 Kbyte or 1 44 Mbyte 3 5 inch floppy disk See the System accessories available in Chapter 10 for disk part numbers Disk Formats The analyzer s built in disk drive can access both LIF logical interchange format and DOS formatted disks The disk drive and the memory disk can also initialize a new disk in either LIF or DOS format The following list shows the applicable DOS formats for the analyzer m 1 44 Mbyte 80 tracks double sided 18 sectors track Memory disk Capacity The memory disk capacity is 448 Kbyte This capacity includes the directory area The capacity of data area depends on the disk format type Copy Files Between the memory disk and the floppy Disk A copy function is provided to copy files between the memory disk and the floppy disk FILE UTILIT
208. de phase R jX G jB Real imaginary Real imaginary B 10 Input Range and Default Setting System System Function Range Preset Value Power ON Factory default Setting Logging ON OFF No effect No effect Memory partition 64kRAM 448kBASIC No effect No effect 128kRAM 128kRAM 334kBASIC 334kBASIC 256kRAM 256kBASIC 334kRAM 128kBASIC 44SkRA M 64kBASIC Clock time 0 00 00 to 23 59 59 No effect No effect 0 00 00 Clock date 3 1 1900 to 12 31 2099 No effect No effect Date mode MonDay Year Day MonYear MonDay Year MonDay Year Beep done ON OFF ON ON Beep warning ON OFF OFF OFF Limit line ON OFF OFF OFF Limit test ON OFF OFF OFF Limit beep OFF Path Fail OFF OFF Limit segment l to 18 Upper limit 1x10 to 1x10 0 0 Lower limit 1x10 to 1x10 0 0 Delta limit 1x10 to 1x10 0 0 Middle value 1x10 to 1x10 0 0 Stimulus offset Frequency 1 8 GHz to 1 8 GHz 0 0 OSC level l tol V 0 0 DC V 40 to 40 V 0 0 DC I 100x107 to 100x107 A 0 0 Limit line amplitude offset 1x10 to 1x10 0 0 Input Range and Default Setting B 11 Local Function Range Preset Value Power ON Factory default Setting GPIB controller mode System controller addressable No effect No effect addressable Address 4291 0 to 30 No effe
209. e 2 6 gt 3 2 gt 3 2 channel coupling 6 4 circuit model 11 6 clear markers 7 5 clock 8 4 On 2 7 Cm 2 7 Cmp 2 7 CMP 2 7 CO 2 7 color 5 44 color monitor 2 10 color printer 8 23 color reset 5 44 compen kit 5 62 compensation coefficient arrays 9 5 compensation points 5 57 complex permeability 11 30 complex permittivity 11 26 complex plane 5 30 Conductance 11 4 connectors 2 9 continuous marker 7 5 continuous mode 7 21 controller 8 45 controller address 8 19 Copy 1 6 8 22 copy abort 8 29 copy time ON OFF 8 29 Cor 2 7 COR 2 7 coupling channel 6 4 coupling channels 3 2 Cpl 2 5 cross channel 7 9 Index 3 Index 4 CROSS CHAN on OFF 7 9 cw freq 6 10 cw frequency 2 6 D M 2 7 data arrays 8 49 9 5 data math 5 34 5 38 9 6 data math gain ON Gx 2 7 data math offset ON 0 2 7 data math ON D M D M D M Hld 2 7 DATA amp MEMORY 5 33 data only 8 49 data processing 9 2 DATA MEMORY 5 33 Data Trace arrays 8 49 data trace arrays 9 6 dc bias 6 10 dc bias option 10 1 D Dissipation Factor 11 4 default color 5 44 default colors 5 43 default gain offset 5 39 delay time 6 4 Amarker 7 6 Amarker 7 6 Amarker funciton 7 9 AMKR SWP PARAM 7 6 Amode 7 21 delta mode ON OFF 7 6 digital filter 9 3 discrete marker 7 5 discrete mode 7 21 disk capacity 8 48 disk format 8
210. e 50 Q LOAD is less than 10 at high frequencies To reduce the uncertainty of the measured phase the analyzer uses a low loss air capacitor as a phase standard whose dissipation factor D is kept below 107 at around 1 GHz The following steps show how the analyzer improves phase measurement accuracy using a low loss air capacitor 1 Measure the OPEN SHORT and LOAD standards and the Low Loss air capacitor 2 Assuming the impedance of the 50 Q LOAD is Zi 50 e that is the phase of 50 Q LOAD is zero as shown in Figure 11 12 a calculate the calibration coefficient A B and C 3 Execute the correction for the Low Loss air capacitor and get the corrected impedance value of the Low Loss air capacitor Zec 4 Calculate the phase difference A0 between the phase of Z and the true phase of the Low Loss air capacitor see Figure 11 12 b AP bec bes 11 25 Where boc arg Lc 6 is standard phase value of the Low Loss air capacitor 5 Modify the impedance of the 50 Q LOAD to Zi whose phase is A9 and whose impedance magnitude is still 50 Q see Figure 11 12 c The modified impedance value of 50 Q LOAD e is expressed in the following equation Zi 50 e 7 8 11 26 Calibration Concepts 6 Calculate the calibration coefficients A B and C again by normal OPEN SHORT LOAD calibration using the modified 50 Q LOAD impedance value Zic The analyzer performs this procedure automatically when a
211. e marker to a specified target point on the trace The target value is in units appropriate to the current format In delta marker mode the target value is the value relative to the Amarker If no Amarker is on the target value is an absolute value SEARCH LEFT Searches the trace for the next occurrence of the target value to the left SEARCH RIGHT Searches the trace for the next occurrence of the target value to the right SUB MKR Displays the following softkeys which are used to put a sub marker on the present marker position O SUB MKR 1 2 3 4 5 6 7 These keys put a sub marker at the present marker position Peak Menu PEAK NEXT PEAK NEXT PEAK LEFF NEXT PEAK RIGHT PEAK DEF MENU Ld THRESHOLD ON off THRESHOLD VALUE MRES THRESHOLD PEAK PLRTY POS neg PEAK DEF SX PEAK DEF AY MKR gt PEAK DELTA RETURN SUB MKR UB MKR t F AIS ea EE Re P4 Figure 7 9 Peak Menu PEAK Moves the marker to the maximum or minimum peak NEXT PEAK Moves the marker to the next peak NEXT PEAK LEFT Moves the marker to the peak on the left of the present marker position NEXT PEAK RIGHT Moves the marker to the peak on the right of the present marker position PEAK DEF MENU Displays the following softkeys whic
212. e of the OSC level on the marker points AC I Displays the current value of the OSC level on the marker points DC V Displays the voltage value of the dc bias on the marker points DC T Displays the current value of the dc bias on the marker points Marker Block 7 19 Marker Function Marker Function Three Types of Markers Marker Value Three types of markers are provided for each channel The first is the active marker or the marker that is displayed on the screen as Y when Marker Maker Search or Utility is pressed When a marker is turned on and no other function is active the marker can be controlled with the knob or the step keys The second is the sub markers that appear at the present marker position when a softkey in the sub marker menu is pressed The seven sub markers can be displayed for each channel at the same time a total of 14 The third is the Amarker that defines a reference position of the delta mode There are three Amode markers Amarker normal tracking Amarker and fixed Amarker Markers have a stimulus value the x axis value in a Cartesian format and a measurement value the y axis value in a Cartesian format In a polar Smith admittance chart or complex plane format the second part of a complex data pair is also provided as an auxiliary measurement value The marker can be moved to any point on the trace Its measurement and stimulus values are displayed at the top r
213. e operating frequency up to 500 MHz 16093A B Binding post test fixtures The 16093A B are suited for the measurement of relatively large size axial and radial lead components or devices that do not fit other fixtures The 16093A is provided with two small binding post measurement terminals set at 7 mm intervals The usable frequency operating of the 16093A is up to 250 MHz The 16093B employs a common type three binding post terminal arrangement that includes an extra guard post terminal The terminal interval is 15 mm The usable frequency operating of the 16093B is below 125 MHz 16094A Probe test fixture The 16094A provides probing capability for measuring circuit impedance and components mounted on circuit assemblies The usable frequency operating of the 16094A is below 125 MHz System accessories available System rack Printer 10 4 Options and Accessories The 85043B system rack is a 124 cm 49 inch high metal cabinet designed to rack mount the analyzer in a system configuration The rack is equipped with a large built in work surface a drawer for calibration kits and other hardware a bookshelf for system manuals and a locking rear door for secured access Lightweight steel rails support the instrument along their entire depth Heavy duty casters make the cabinet easily movable even with the instruments in place Screw down lock feet permit leveling and semi permanent installation The cabinet is extremely stable wh
214. eads 2 11 This function inputs data from the 4 bit parallel input port to the analyzer and returns the data to the HP Instrument BASIC program m Circuit of I O Port Figure 2 5 shows the internal circuits of the I O port 1502 INPUT Ii OUTPUT 1009 24m max Input Port Output Port 26002005 Figure 2 5 Circuit of I O Port m Connector a D SUB 15 pin 2 12 Front and Rear Panel Test Station and Test Heads Test Station 1 Cable 6 Test Station Mounting Screws 2 Test Fixture Mounting Posts 5 Heat Sink 3 Test Fixture Mounting Screws 4 Test Head Connectors CE002006 Figure 2 6 Test Station 1 Cable Connects to test station to the front panel of the main frame 2 Test Fixture Mounting Posts Locates and positions a test fixture to be used 3 Test Fixture Mounting Screws Fixes a test fixture to be used 4 Test Head Connectors Connects to a test head Caution i Protect the instrument from ESD damage by wearing a grounding strap that provides a high resistance path to ground Alternatively ground yourself to discharge any static charge built up by touching the outer shell of any grounded instrument chassis before touching the test port connectors Front and Rear Panel Test Station and Test Heads
215. eak value without searching separately for the maximum and minimum values m SMTH POLAR MENU Displays softkeys to select the form of the complex marker value on the Smith polar and admittance charts This softkey does not appear if the user trace display is turned on O REAL IMAG Displays the values of the marker on a Smith chart an admittance chart a polar chart or a complex plane as a real and imaginary pair The complex data is separated into its real and imaginary parts The first marker value given is the real part M cos and the second value is the imaginary part M sin6 where M magnitude 7 18 Marker Block LIN MAG PHASE Displays a readout of the linear magnitude and the phase of the marker Marker magnitude values are expressed in units of the current format and phase values in degrees LOG MAG PHASE Displays the logarithmic magnitude value and the phase of the marker Magnitude values are expressed in dB and phase values in degrees R jX Converts the marker values into rectangular form The complex impedance values of the active marker are displayed in terms of resistance and reactance G 3B Displays the complex admittance values of the marker in rectangular form The marker values are displayed in terms of conductance and susceptance in Siemens SWR PHASE Displays the SWR value and phase value of the marker Do not use the SWR Phase marker when the analyzer displays impedance or admittance pa
216. econdary labeling in distance for the velocity of light An estimated impedance value through this function is calculated according to the following concept Zo FL Loss Less Cable Ceottote Figure 11 13 Port Extension When impedance Zi is connected to one tip of extension cable as shown in Figure 11 13 the input impedance from the other tip of cable is expressed using the following equation Zr Zo tanh 41 Zo z tanh 41 11 27 Where Zo 1s the characteristic impedance of the cable Lis the electrical length of the cable representing the physical length of the cable l and the relative permittivity of the material in the cable ey l Verlo 11 28 y is propagation coefficient and expressed as ya jp 11 29 where a is attenuation constant B is phase constant Assuming that the cable is lossless a and 8 satisfy the following conditions a 0 11 30 B 11 31 Co where 11 16 Impedance Measurement Basics Port Extension Co is the velocity of light Therefore tanh 41 tanh j D 0 jtan 1 11 32 Co Because the characteristic impedance of the extension cable for the analyzer should be 50 Q Zo is constant as follows Zo 50 jO 11 33 Substitute these conditions into the equation for Zin Then modify it in order to calculate Zr from Zin Zr can be determined by using the following equation Zin J50 tan wAt
217. ected the menu accessed from the SELECT FIXTURE softkey lists only the impedance fixtures The Meas and Cal keys lead only to the menus related to the impedance measurement When a fixture has been specified its label is displayed in brackets in the softkey label m PERMITTVTY 16453 Selects permittivity measurement This function doesn t sets the electrical length When this softkey is selected the and keys lead only to the menus related to the permittivity measurement m PERMEABILITY 16454 Selects the permeability measurement When this softkey is selected the menu accessed from the SELECT FIXTURE softkey lists only magnetic material fixtures The and keys lead only to the menus related to the permeability measurement When a fixture size has been specified the size is displayed in parenthesis in the softkey label m SELECT FIXTURE Leads to the following softkeys which are used to select test fixture for impedance measurement D FIXTURE NONE Sets zero as the electrical length value As the case you do the load compensation select this setting O 16191 Sets the electrical length that is suitable for the 16191A Measurement Block 5 15 Impedance Measurement 16192 Sets the electrical length that is suitable for the 16192A 3 116193 Sets the electrical length that is suitable for the 16193A 16194 Sets the electrical length that is suitable for the 16194A 4 USER Sets the electrical length which is a user defined
218. ector 2 10 keyboard template 12 51 k m 4 2 knob 4 2 L 11 4 label 5 35 5 45 LCD 2 4 left peak 7 14 level monitor 2 5 6 11 LIF logical inter change format 8 48 limit line concept 8 40 limit test 8 14 linear sweep 6 5 line switch 2 3 listener 8 44 list sweep 6 5 1 6 8 19 logging ON OFF 8 4 log sweep 6 5 loss 7 22 low impedance test head 1 2 low impedance test head add option 10 1 low loss air capacitor calibration 11 12 main frame 1 2 man 2 7 manual changes A 1 manual trigger 6 13 marker 7 20 coupled maker 3 2 marker 7 4 1 5 7 3 marker block 1 5 marker coupling 7 5 marker data readout 2 5 marker list 7 19 marker 7 7 marker search 7 22 marker statistics 2 5 marker time mode 7 20 Marke 1 5 material measurement firmware option 10 1 material size 5 22 5 29 Max 2 5 MAX 7 11 max search 7 11 less 1 4 5 3 measured input 2 5 Index 7 Index 8 measurement block 1 4 measurement block 5 1 measurement circuit 11 12 measure restart 6 13 memory arrays 8 49 9 5 memory disk 8 48 memory partition 8 4 memory trace 5 33 5 36 memory trace arrays 8 49 9 6 memory trace number 5 33 menu 2 2 message area 2 8 Min 2 5 MIN 7 11 min search 7 11 MKRA CENTER 7 9 MKRA SEARCH RNG 7 15 MKRA SPAN 7 9 MKR REFERENCE 7 9 MKR CENTER 7 9 MKR LEFT RNG 7 1
219. ed m MODIFY Leads to the following softkeys which are used to modify a default definition of OPEN SHORT and LOAD for the fixture compensation O DEFINE STANDARD Leads to the following softkeys which are used to define the parameters of OPEN SHORT and LOAD for the fixture compensation m LOAD y REAL Makes the effective relative permittivity of the LOAD standard the active function m X LOSS Makes the relative dielectric loss factor of the LOAD standard the active function m THICKNESS Makes thickness of LOAD standard the active function LABEL KIT Leads to the Letter menu to define a label for a new set of user defined OPEN SHORT and LOAD This label appears in the COMPEN KIT softkey label in the Calibration menu and 5 64 Measurement Block the MODIFY label in the Compen Kit menu It is saved with the calibration data co KIT DONE MODIFIED Completes the procedure to define user defined OPEN SHORT and LOAD for fixture compensation Thickness d EE r er jer Figure 5 51 Parameters of LOAD for the Premitttivity Fixture Compensation Measurement Block 5 65 Port Extension Menu Note 5 66 Measurement Block uy Cal PORT EXTENSI N EXTENSION ON off EXTENSION VALUE RETURN Figure 5 52 Port Extension Menu EXTENSIONS ON off Turns port extension oN or orr When this function is oN all extensions defined below it are enabled when OFF none of the extens
220. ed menus provide control of measurement parameter display equivalent circuit analysis averaging calibration and fixture compensation The following list shows the functions controlled by each key in the measurement block MEASUREMENT ens Format Display IER j Bw j e ef Avg Figure 5 1 Measurement Block Selecting parameter to be measured Selecting test fixture impedance permittivity e and permeability u fixtures Selecting display format such as rectangular Smith chart admittance chart polar chart and complex plane Selecting display trace data and memory Storing data trace to memory trace Selecting display mode m Dual Single channel m Split Override Allocating screen between analyzer and HP Instrument BASIC Performing trace math Displaying titles and text Erase frequency display Adjusting display color and intensity Calculating equivalent circuit parameters and simulating equivalent circuit Displaying user traces Scale Ref Scaling trace Bw Avg Controlling averaging function Performing calibration and fixture compensation measurement Defining standard kits for calibration and fixture compensation Measurement Block 5 1 Functions accessed from this block You can access See the following section in this from chapter Admittance chart format Format Format menu Averaging Bw Avg Averaging menu BASIC screen Display Display menu Cal kit definiti
221. ed partially along the stimulus axis the non limit testing portion must also be entered Set the non limit testing portion by forcing the upper and lower limit values out of range 1 GQ and 1 GQ for example Both an upper limit and a lower limit or delta limits must be defined If only one limit is required for a particular measurement force the other limit out of range 1 G or 1 G for example Turning Limit Lines and Limit Testing On and Off Limit lines and limit testing features are oFF unless explicitly turned ON by the user After entering the limit line information you can turn ON the limit line feature and optionally the limit testing features Turning these features orr has no effect on the entered limit line information Instrument State Block 8 41 Limit Line Concept Segment Entering Order Generally the segments do not have to be entered in any particular order The analyzer automatically sorts them and lists them on the display in increasing order of stimulus value One exception is when two segments have the same stimulus value as described in Figure 8 26 If the same stimulus values exist the analyzer draws the limit lines according to entered segment order For example in Figure 8 26 segment 1 should be entered in advance of segment 2 Saving the Limit Line Table Limit line information is lost if the LINE switch is turned off However the Save and keys can save limit line inform
222. een menu is displayed to enable hard copy listings and access new pages of the table Table 8 1 shows the data listed on the screen when DUAL CHAN and or COUPLED CHAN are OFF The margin listed is the smaller of the difference values between the measurement value and either the upper or lower limit A plus margin means the test passed and a minus margin means it failed Table 8 1 List Value Format Display Values Listed Format 1st column 2nd column 3rd column 4th column 5th column LIN Y AXIS LOG Y AXIS Sweep Measurement Margin Upper Limit Lower Limit Parameter Data Value Value SMITH CHART POLAR Sweep Measurement Measurement Upper Limit Lower Limit Parameter Data Data Value Value ADMITTANCE CHART COMPLEX PLANE Instrument State Block 2 This is listed when the limit test is on 1 An is displayed at the left of the measurement value when it fails the limit testing The analyzer can list the values measured on both channels When the dual channel is turned on and both channels are coupled the sweep parameter value is listed in the first column the measurement data of the active channel is listed in the second and third columns and the non active channel data is listed in the fourth and fifth columns The values listed for each channel are the same as the data listed in the second and third columns in Table 8 1 m OPERATING PARAMETERS Displays the Screen menu and provid
223. eferred to as the main frame The system includes the analyzer test station test heads fixtures and keyboard The analyzer features include the front and rear panels and the six key blocks The front and rear panel sections provide information on the input output connectors the LCD and other panel features The six key block sections describe the keys and their associated menus and how they function together Introduction 1 1 System Overview The 4291B system is shown in Figure 1 1 Figure 1 2 and Figure 1 3 onloda OOo CE001001 Figure 1 1 4291B System Overview 1 Main frame 2 Test station furnished with the main frame 3 Cal kit furnished with the main frame 4 High impedance test head furnished with the main frame 5 Low impedance test head furnished with option 012 6 mini DIN Keyboard cq o alia o Whe ou p AO 0 E o ER LT 208 o UA O pana rar ame uo e
224. el unit The OSC level unit is displayed in brackets in the softkey label O VOLTAGE Selects voltage as the OSC level unit HL AMPERE Selects ampere as the OSC level unit H dBm Selects dBm as the OSC level unit CW FREQ Sets the frequency for the OSC level sweep and DC bias sweep DC BIAS on OFF Turn dc bias ON or OFF DC BIAS MENU Leads to the following softkeys which are used to specify level unit and voltage or current limit of dc bias O SOURCE Toggles the dc bias mode between the voltage setting current compliance mode and the current setting voltage compliance mode The dc bias setting mode VOLT or CURRENT is displayed in brackets in the softkey label Cl BIAS VOLTAGE Sets voltage of dc bias for voltage setting mode BIAS CUR LIMIT Sets current limit value of dc bias for voltage setting mode O BIAS CURRENT Sets current value of dc bias for current setting mode c BIAS VOLT LIMIT Sets voltage limit value of dc bias for current setting mode Note The de bias setting is common to both channels In other words you i Y Y cannot turn on or off the de bias of either channel 1 or 2 The de bias is automatically turned off when the calibration or fixture compensation measurement is done Marker Level Monitor Function The analyzer can monitor the OSC level output and dc bias level applied to the DUT at each stimulus point using the marker The softkey for the marker level monitor can be a
225. ely value as Eeage of 16453A The analyzer uses the following approximate value of Eeage for the 16453A Edge 434408231 70 35 where t m Residual Parameter In fact the 16453A has residual impedance and stray admittance which cause an increased error when measuring the admittance of the MUT To eliminate residual and stray admittance the OPEN SHORT and LOAD fixture compensations are required for any permittivity measurement using the 164534 Because the equation to compensate for measurement admittance value is same as the equation for the OPEN SHORT LOAD fixture compensation for impedance measurement see Fixture Compensation for more information on OPEN SHORT and LOAD fixture compensation Permeability Measurements Permeability Measurements In general when current is flowing along an infinity line as shown in a of Figure 11 20 magnetic flux density B is generated by the current as follows p it 11 77 Lar When current is flowing in a closed loop as shown in b of Figure 11 20 the magnetic flux generated by the current is LI 11 78 Where L is the self inductance of the closed loop Because the magnetic flux is calculated by the surface integral of the magnetic flux density B s shown in C of Figure 11 20 is also expressed by the following equations be fs 11 79 Ceotlo22 Figure 11 20 Basic Relationship of Magnetic Flux Density Magnetic Flux
226. en the lock feet are down Power is supplied to the cabinet through a heavy duty grounded primary power cable and to the individual instruments through special power cables included with the cabinet The 4291B is capable of printing displayed measurement results directly to a peripheral without the use of an external computer The compatible printers for printing is Accessories Available Table 10 1 Supported Printers and Printing Modes Printer Monochrome Printing Fixed Color Printing Variable Color Printing HP DeskJet 340J V HP DeskJet 505 HP DeskJet 560C HP DeskJet 694C HP DeskJet 850C HP DeskJet 1200 HP DeskJet 1600CM v v EMEN i a S S GPIB cable An GPIB cable is required to interface the analyzer with computer or other external instrument The following cables are available 10833A 1 m 10833B 2 m 10833C 3 m 10833D 0 5 m Service Accessories Available Collet removing tool Agilent part number 5060 0236 This tool is used to remove the center conductor collet from an APC 7 connector This is required in order to repair the collet if the collect is damaged Collet removing tool guide Agilent part number 04291 21002 This tool is used with the collet removing tool when the collet of the low loss capacitor of the calibration kit is removed 6 Slot collet Agilent part number 85050 20001 The repair part of the collet Options and Accessories 10 5 11 Impedance
227. ent phase 6 m Real part of reflection coefficient I m Imaginary part of reflection coefficient Ty Serial Circuit parameter Serial capacitance C m Serial inductance Ls m Serial resistance R Parallel Circuit parameter m Parallel capacitance Cp m Parallel inductance Lp m Parallel resistance Rp Loss m Dessipation factor D Quality factor Q For more information on measurement parameters and serial and parallel circuit models such as definitions conversion between parameters and the selection guide for circuit models see Impedance parameters in Chapter 11 and Series and Parallel Circuit Models in Chapter 11 Measurement Block 5 13 Impedance Measurement Impedance Fixture Menu No option 002 Meas SELECT FIXTURE FIXTURE NONE FIXTURE INONE 16191 16192 16193 16194 USER RETURN SAVE USER EXTR KIT MODIFY NONE DEFINE EXTENSION LABEL FIXTURE KIT DONE MODIFIED RETURN Figure 5 11 Impedance Fixture Menu No option 002 m FIXTURE Leads to the following softkeys which are used to select test fixture for impedance measurement Cl FIXTURE NONE Sets zero as the electrical length value As the case you do the load compensation select this setting C 16191 Sets the electrical length that is suitable for the 16191A 16192 Sets the electrical length that is suita
228. er Menu LOGGING on OFF Limit SERVICE cuMenu MENU Figure 8 3 System Menu CE008003 IBASIC Displays the menu used to operate HP Instrument BASIC PROGRAM MENU MEMORY PARTITION Changes the size of memory areas for HP Instrument BASIC and the memory disk SET CLOCK Displays the series of menus that set an internal clock BEEPER MENU Displays the series of menus that set a beeper LIMIT MENU Displays the series of menus that defines limits or specifications used to test a DUT LOGGING ON off Turns the logging mode on or off When logging is oN the analyzer logs the equivalent GPIB commands of all front panel key inputs into the HP Instrument BASIC program Logging Function ri When an Instrument BASIC program is running waiting for an input or being edited logging cannot be turned on When the analyzer does not have a program loaded the following statements are automatically inserted at the beginning and the end of the program ASSIGN Hp4291 TO 800 END rii When there are already some statements in the Interment BASIC editor the program lines logged are inserted at the current cursor line r1 The short form of the command is logged and the suffix unit of parameter is omitted c If the command logged exceeds the memory capacity for the Instrument BASIC error will occur c If you make an input error when logging is ON t
229. ernal data arrays DATA ONLY ascii Instrument State Block 8 49 Saving and Recalling File Names All data saved using the built in disk drive and the memory disk has an identifying file name A file name consists of the lower and upper case alphabet numbers and valid symbol characters Up to 8 characters can be used for a file name The following table shows the valid characters for LIF and DOS file names Valid Characters for File Names Valid Characters for LIF Valid Characters for DOS Format A Z Upper case alphabet A Z Upper case alphabet a z Lower case alphabet a z Lower case alphabet 0 9 Numeric characters 0 9 Numeric characters under line amp 96 Q Q Symbol 1 LIF is case sensitive 2 DOS is not case sensitive Suffixes LIF and Extensions DOS One of the following suffixes or extensions is automatically added to the file name depending on the data group type stored in the file m Suffixes for LIF S Instrument States and Internal Data Arrays STATE D Internal Data Arrays DATA ONLY binary l Internal Data Arrays as an ASCII File DATA ONLY ASCII T Graphics Image as an TIFF File GRAPHICS m Extensions for DOS STA Instrument States and Internal Data Arrays STATE DAT Internal Data Arrays DATA ONLY binary TXT Internal Data Arrays as an ASCII File DATA ONLY ASCII TIF Graphics Image as an TIFF File GRAPHICS Au
230. es a tabular listing on the display of the key parameters for both channels The Screen menu is presented to allow hard copy listings and access new pages of the table Cony Parameters listed by OPERATION PARAMETERS The following operating parameters are listed in four pages o Sweep Source c Sweep Type c Number of Points o CAL Kit a CAL Type o Test Head y Fixture c Port Extension a Material Size Option 002 only c Calibration States c Compensation States o Trigger Source o Trigger Polarity CAL KIT DEFINITION Displays the Screen menu and lists the standard definition of the cal kit COMPEN KIT DEFINITION Displays the Screen menu and lists the standard definition of the OPEN SHORT and LOAD standard for fixture compensation LIST SWEEP TABLE Displays the copy list sweep menu that can display a tabular listing of the list sweep table and print or plot it LIMIT TEST TABLE Displays the copy limit test menu that can display a tabular listing of the limit value for limit testing and print or plot it Instrument State Block 8 25 Print Setup Menu paint STANDARD COLOR PRINT COLOR PRINT SETUP FIXED DPI TOP MARGIN LEFT MARGIN DEFAULT SETUP RETURN m PRINT STANDARD Sets the print command to the default selection a standard printer that prints in black only or a color printer to yield a black only print COLOR Sets the print command to a default of color
231. eset Value Power ON Factory default Setting Fixture Compen OPEN ON OFF OFF OFF Fixture Compen SHORT ON OFF OFF OFF Fixture Compen LOAD ON OFF OFF OFF Cal Kit 7 mm User kit 7mm 7mm Standard Value OPEN G 1x10 to 1x 10 0 0 Standard Value OPEN C 1x107 to 1x107 82 fF 82 fF Standard Value SHORT R 1x10 to 1x 10 0 0 Standard Value SHORT L 1x106 to 1x 106 0 0 Standard Value LOAD R 1x106 to 1x 106 50 0 50 0 Standard Value LOAD X 1x106 to 1x 106 0 0 Compen Kit Compen Std Value OPEN G 1x106 to 1x 106 No effect No effect 0 Compen Std Value OPEN C 1x107 to 1x107 No effect No effect 0 Compen Std Value SHORT R 1x108 to 1x 108 No effect No effect 0 Compen Std Value SHORT L 1x108 to 1x 108 No effect No effect 0 Compen Std Value LOAD R 1x106 to 1x 108 No effect No effect 50 0 Compen Std Value LOAD X 1x106 to 1x 106 No effect No effect 0 Compen standard Label No effect No effect user Port extension ON OFF OFF OFF Port Extension value 10 to 10 0s 0s 1When SAVE COMPEN KIT is executed B 6 Input Range and Default Setting EUA Cal Ed C Function Range Preset Value Power ON Factory default Setting Material size Thickness 1 um to 4 8 mm invalid invalid LOAD er 1x106 to 1x 106 not effect not effect 2 1 LOAD e 1x106 to 1x 108 not effect not effect 0 LOAD Thi
232. eshooting Header Suffix out of range The value of a numeric suffix attached to a program mnemonic makes the header invalid 237 208 224 282 283 Temperature Coefficient Measurement HI Z HEAD TEST FAILED An external test 30 HIGH Z HEAD fails See the Service Manual for troubleshooting HP IB CHIP TEST FAILED An internal test 1 Al CPU fails The Al CPU s GPIB chip does not work properly Replace the Al CPU with a new one See the Service Manual for troubleshooting Illegal parameter value Used where exact value from a list of possibilities was expected Illegal program name The name used to reference a program was invalid For example redefining an existing program deleting a nonexistent program or in general referencing a nonexistent program Illegal variable name An attempt was made to reference a nonexistent variable in a program Init ignored A request for a measurement initiation was ignored as another measurement was already in progress INSUFFICIENT MEMORY If a lot of tasks is executed at same time memory might be insufficient for a while For example running HP Instrument BASIC program printing a screen and sending or receiving data array by GPIB are required at same time Please wait until finishing some tasks then execute the next task Invalid block data A block data element was expected but was invalid for some reason see IEEE 488 2 7 7 6 2 For exam
233. ess Ema pispay Rej RS fea Introduction J The following sections describe the analyzer s features Individual chapters following this chapter describe each block of controls in more detail Analyzer functions are activated from the front panel by using front panel hardkeys or softkeys Measurement results are displayed on the LCD which also displays the measurement conditions and the instrument status The front panel has input output and control ports to connect to the test station and a floppy disk drive to store data and instrument status The rear panel has input and output connectors to control the analyzer from an external controller or to control external devices from the analyzer The rear panel also has a connector used to control a BASIC program a connector for an external keyboard and a parallel I O port controlled by the program For more information see Chapter 2 The analyzer has two channels for independent measurement of parameters and display of data This block has two keys that select the active channel Once an active channel is selected you can control it using the front panel keys and display its trace and data annotations If you want to use the other channel you must select the new channel before you make any other changes For more information see Chapter 3 This block provides the numerical and units keypad the knob and the step keys These controls are used i
234. fixture 10 3 16194A high temperature component fixture 10 3 16194A High temperature component test fixture 1 3 16453A dielectric material test fixture 10 3 16453A Dielectric material test fixture 1 3 16454A Magnetic material test fixture 1 3 10 3 4291V upgrade kit 10 2 46021A keyboard 12 51 Index 1 Index 2 85043B system rack 10 4 accessory 12 51 accessory part number 12 51 active channel 3 2 active channel 2 4 active channel block 1 4 active channel block 3 1 active entry area 2 8 AD converter 9 3 addressable 8 46 addressable only 8 19 address setting 8 19 adjust display 5 42 ADJUST DISPLAY 5 35 Admittance 11 4 Agilent part number 12 51 APC 7 2 17 approximate 12 1 AUTOREC 8 39 8 50 auto recall 8 39 8 50 auto scaling 5 49 aux offset 5 39 averaging 5 52 9 4 averaging factor 5 52 averaging ON Avg 2 7 Avg 2 7 B 11 4 background intensity 5 42 Back Space 4 3 BACK SPACE 5 46 BASIC 8 4 BASIC draw 5 36 BASIC screen 5 36 battery backup B 1 beeper 8 4 block 1 1 block diagram 9 1 brightness 5 44 Bus 2 7 bus trigger 6 13 BW 7 22 Bw Avg 1 5 C 11 4 C 2 7 C 2 7 C 2 7 C 2 7 C 2 7 C 2 7 E 1 5 calibration 5 55 calibration coefficient arrays 9 4 calibration coefficients arrays 8 49 cal kit 1 2 calkit 5 60 cal points 5 55 Capacitance 11 4 cent 7 22 gt 1 5 center valu
235. g bilinear form ty AP 1 CZy Where A B and are complex constants calibration coefficients related to the circuit 11 24 If three standards that have known impedance value are measured these three constants can be calculated The analyzer uses the Impedance Measurement Basics 11 13 Calibration Concepts OPEN SHORT and LOAD standards furnished for the calibration Once these constants are known any impedance of the DUT can be calculated from the measured impedance value Where B represents residual impedance when the circuit is perfectly shorted and e represents stray admittance when the circuit is perfectly open Low Loss Capacitor Calibration 11 14 Impedance Measurement Basics Accurate Q measurements require good analyzer stability and correct markings on the phase scale of the analyzer In particular high Q or low D dissipation factor measurements at high frequencies require high accuracy for phase measurements The phase accuracy of the analyzer is determined entirely by the OPEN SHORT LOAD calibration But it is not guaranteed that the phase uncertainty for a 50 Q LOAD at high frequencies is lower than the uncertainty requirement for a high Q measurement For example if you want to measure the Q factor with 10 of uncertainty for a DUT whose Q value is almost 100 the uncertainty for phase scaling must be less than 10 But it is difficult to ensure that the phase uncertainty for th
236. ger BNC in rear panel Waiting for manual trigger Waiting for GPIB trigger A service mode is turned on If this notation is shown the measurement data will be out of specifications See Service Manual for more information Service manual is furnished with Option OBW 17 Equivalent Circuit Parameters 18 External Reference Displays equivalent circuit parameters by using menu accessed with Display key See Equivalent Circuit Menu in Chapter 5 ExtRef is displayed when an external reference signal is connected to the external reference input on the rear panel even if phase is not locked Front and Rear Panel Test Station and Test Heads 2 7 19 Active Entry Area Displays the active function and its current value 20 Message Area Displays prompts or error messages See Error Messages for more information on error messages 21 Title Displays a descriptive alpha numeric string title defined by you and entered as described in Display in Chapter 5 2 8 Front and Rear Panel Test Station and Test Heads Rear Panel Features and Connectors Figure 2 3 shows the features and connectors on the rear panel Requirements for the input signals to the rear panel connectors are provided in Chapter 12 9 Reference Oven Output option 1D5 only 8 External Trigger Input CE002003
237. gger source can only be selected by using the GPIB command ou FREE RUN Selects the internal trigger Cl EXTERNAL Selects the external trigger input from the EXT TRIGGER input BNC on the rear panel D MANUAL Selects the manual trigger and triggers a sweep HD TRIG EVENT Toggles the trigger event mode ON POINT The analyzer triggers on each data point in a sweep ON SWEEP The analyzer triggers a sweep TRIG PLRTY POS neg Selects the trigger signal polarity of an externally generated signal connected to the rear panel EXT TRIGGER input POS neg The sweep is started by a low to high transition of a TTL signal pos NEG The sweep is started by a high to low transition of a TTL signal MEASURE RESTART Aborts the sweep in progress and then restarts the measurement This can be used to update a measurement following an adjustment of the DUT or test signal source y If the analyzer is measuring a number of groups the sweep counter is reset to 1 H If averaging on sweep is on MEASURE RESTART resets the sweep to sweep averaging and is effectively the same as AVERAGING RESTART H If the sweep trigger is in the HOLD mode MEASURE RESTART executes a single sweep O If DUAL CHAN is on screen displays both measurement channels MEASURE RESTART executes a single sweep of both channels even if COUPLED CH is off Stimulus Block 6 13 Start Stop Center Span S Sion Ea Gea 6 14 Stimulus Block
238. gh impedance measurement test head This test head is furnished with 4291B This test head is also used with the 16453A Dielectric Material Test Fixture The impedance measurement accuracy using this test set is shown in the Chapter 12 bound with this manual Front and Rear Panel Test Station and Test Heads 2 15 Low Impedance Measurement Test Head Option 012 only This test head is designed to measure low impedance with better accuracy As a guide when the impedance value of a DUT is less than about 5 Q use the low impedance measurement test head This test head is furnished with Option 012 This test head is also used with the 16454A Magnetic Material Test Fixture The impedance measurement accuracy using this test set is shown in the Chapter 12 bound with this manual When impedance of a DUT is almost in the range from 5 Q to 300 Q either or both test heads can be used High Temperature High Impedance Test Head Option 013 only This test head is designed to measure high impedance components or materials in wide temperature range The analyzer can measure components or materials in temperature range from 55 C through 200 C when this test head is used with the 16194A High temperature component fixture or the 16453A Dielectric Material Test Fixture This test head is furnished with Option 013 The dimensions of this test head and the impedance measurement accuracy using this test set is shown in the Chapter
239. gure 11 14 shows an equivalent circuit model of the measuring circuit that includes unknown component and parasitic parameters usually called residual parameters These residual parameters cause two kinds of measurement errors which are described in the following paragraphs Test Head Where R Lead or electrodes resistance of DUT Re Contact resistance Rr Residual resistance of test fixture Ly Lead or electrodes inductance of DUT Lr Residual inductance of test fixture C Stray capacitance of DUT Impedance Measurement Basics 11 19 Fixture Compensation Cr Stray capacitance of test fixture G Residual conductance of DUT M Mutual inductance between leads or electrodes of DUT Characteristics of Test Fixture Test Head Loss Less Coupling Terminal Section Contact Section Test Fixture Figure 11 15 Characteristics of Test Fixture Electrical Length of Coaxial Coupling Terminal Section The test fixtures are basically composed of two major components a coaxial coupling terminal and the contact electrodes terminals combined in one unit The electrical length value specified for each type of fixture is calculated for the coaxial coupling terminal and does not include the electronic factors in the electrodes As the coaxial coupling terminal section of the fixtures is a distributed constant circuit design 500 this fixt
240. gure 5 27 Softkey Menu Accessed from Display Key Display Menu bigis DUAL CHAN ON aff Display SPLIT DISP neS DEFINE TRACE i DISPLAY DATA MEMORY DATA and MEMORY DATA gt MEMORY SELECT MEMORY NO SEL D MEM an OFF CLEAR MEMORIES RETURN p Data Math ors MORE TELE Title Menu MENU gt Label Menu TRACE DATAS MEM GRATICULE ON off AUN Adjust Display Menu FREQUENCY BLANK RETURN Figure 5 28 Display Menu DUAL CHAN ON off Toggles between the display of both measurement channels or the active channel only This is used in conjunction with SPLIT DISP ON off to display both channels SPLIT DISP ON off Toggles between a full screen single graticule display of one or both channels and a split display with two half screen graticules one above the other The split display can be used in conjunction with DUAL CHAN ON to show the measured data of each channel simultaneously on separate graticules DISPLAY ALLOCATION Displays the Display Allocation menu which is used to allocate the BASIC screen area on the display DEFINE TRACE Leads to the following softkeys which are used to select traces displayed the data trace and the memory traces O DISPLAY DATA Displays the current measurement data trace for the active channel O MEMORY Displays the trace memory for the active channel If no data is
241. h are used to define peak to be searched O THRESHOLD on OFF Toggles the threshold on and off HD THRESHOLD VALUE Sets the threshold values DJ MKR THRESHOLD Changes the threshold value to the amplitude value of the present marker position O PEAK PLRIY POS neg Selects the peak polarity for the marker search functions PEAK PLRIY POS neg shows the positive peak is selected PEAK PLRIY pos NEG shows the negative peak is selected o PEAK DELTA AX Sets the peak delta AX value that is used to define the peak D PEAK DELTA AY Sets the peak delta AY value that is used to define the peak D MKR PEAK DELTA Changes the peak delta value to the smaller value of the difference of amplitude values between the present maker position and both side display points of the marker Marker Block 7 13 Search Peak Function Definitions Peak polarity Detects either the positive or negative peak that is defined by PEAK PLRTY POS neg Threshold Detects a peak whose amplitude value is greater than or equal to the threshold even if the peak polarity is negative Threshold is used in order to reject the noise floor Peak Delta Detects a peak whose differences of amplitude values between the peak and both side display points of the peak are greater than or equal to the peak delta value specified by PEAK DELTA The peak delta function is used to reject small peaks m SUB MKR Displays the following softkeys which are used to put a sub
242. he 16194A and High Temperature Test Head for High Impedance or the measurement frequency is above 500 MHz the Load compensation is required Load Compensation Connect the Load to the 16194A just as you connected the shorting device in the Short compensation The Load device is included with 16194A When the test fixture is ready for the Load compensation sequence perform the following procedure l Press LOAD After the Load compensation sequence is done the LOAD softkey label is underlined 2 Press DONE COMPEN When your DUT is leaded type the compensation procedure is as follows 1 Perform the Short Compensation using the biggest shorting device Agilent P N 16191 29004 2 Perform the Load Compensation using the furnished load device 9 Replace the pressure arm pin for SMD with one for a leaded component 06201028 4 Adjust the stage to fit your DUT 5 Perform the Open Compensation Option 013 014 Temperature Coefficient Measurement C 7 Temperature Coefficient Measurement If you use both the 16194A and High Temperature Test Head for Low Impedance and the measurement frequency is below 500 MHz the Load compensation is not required Saving Status File After performing calibration fixture compensation at your required settings save the settings with the calibration fixture compensation data to the st
243. he Peak Definition menu See the Peak Definition menu for more information on peak definition This softkey does not appear if the user trace display is turned on SEARCH TRK ON off Toggles the search tracking This is used in conjunction with other search features such as sarch MAX MIN TARGET and PEAK to search each new sweep This softkey does not appear if the user trace display is turned on SEARCH TRK ON off Directs the analyzer to search every new trace for the specified target value and puts the active marker on that point SEARCH TRK on OFF When the target is found on the current sweep it remains at the same stimulus value regardless of changes in trace amplitude values in subsequent sweeps m WIDTHS Displays the menu that is used to define the start and stop points for a width search and to turn width search on and orr This softkey does not appear if the user trace display is turned on OFF Shows the width search is turned off TON Shows the width search is turned on m SEARCH RANGE MENU Displays the Search Range menu Marker Block 7 11 Target Menu 7 12 Marker Block TARGET SEARCH LEFT TARGET SEARCH gt RIGHT SUBMKR SUB MKR 1 CE007008 Figure 7 8 Target Menu TARGET Makes the target value the active function in which to enter a value and moves th
244. he analyzer generates the equivalent codes faithfully and the resulting program is incorrect rm The logging function does not truncate the repeated nodes of the SCPI command This makes program lines longer than necessary rc The logging function does not take into consideration the requirements of a timing sensitive operation such as triggering or a fixture compensation procedure Therefore you need to add or rewrite the lines for that part of a program to run correctly System m SERVICE MENU Displays the series of service menus described in the Service Manual The Service Manualis furnished with Option OBW Instrument State Block 8 5 Instrument BASIC menu 8 6 Instrument State Block Step Continue Pause Stop BASIC gt Edit N ASSIGN Hp4291 OUTPUT Hp4291 ENTER Hp4291 END GOTO NE RECALL LNE ND EDIT ON KEY EABEES Y user define user del ine CAT SAVE RE SAVE GET EPURGE N HALIZE MS NTERNAL SCRATCH RENumpber EIST COMMAND ENTRYH y SELECT LETTER SPACE BACK SPACE ERASE TLE DONE CANCEL CLEAR 1 0 RESET
245. he current limit DC bias output is clamped to the voltage limit Error correction in fixed cal points is on Error correction with low loss capacitor in fixed cal points is on Error correction in user cal points is on Error correction with low loss capacitor in user cal points is on Stimulus parameters have changed and interpolated error correction in user cal points is on Stimulus parameters have changed and interpolated error correction with low loss capacitor in user cal points is on Error correction in user cal points is on but questionable Caused by extrapolation Error correction with low loss capacitor in user cal points is on but questionable Caused by extrapolation Fixture compensation in fixed compensation points is on Fixture compensation in user compensation points is on Stimulus parameters have changed and interpolated fixture compensation is on Fixture compensation in user compensation points is on but questionable Caused by extrapolation Port extension has been added or subtracted Del stands for delay Sweep by sweep averaging is on The averaging count is shown below Data math Data Trace Memory Trace is on Data math Data Trace Memory Trace is on Data math Data Trace Memory trace is on Data math Data TracexMemory trace is on Data math Gain is on Data math Offset is on Data math Gain and Offset are on Hold sweep Fast sweep indicator Waiting for external trig
246. he electrical length of the transmission line is not being taken into consideration The phase angle scales for the reflection coefficient vector are provided along the outer circumference of the Smith Chart The phase angle of the reflection coefficient can be read from the phase angle scale as indicated by an extension of the vector Zo Z The absolute value of the reflection coefficient T is constant at any point on the circle of the radius Zo Z 11 10 Impedance Measurement Basics Smith Chart I value is constant Phase angle of reflection coefficient Figure 11 8 Impedance Read out When a coaxial cable of line length is terminated by the sample and the cable is lossless the impedance value of the sample measured at the other end of the line is derived as follows First the difference in phase angle of the reflection coefficient value T produced by the lead length 2 is calculated using the following equation 7 Anl IESU Where A is the wavelength of test signal 6 11 18 Next the radius vector Zo Z is rotated clockwise towards the generator by the calculated phase angle 6 The measured impedance value normalized impedance coincides with the scale reading at point Zm see Figure 11 9 Ceoti009 Figure 11 9 Phase Sift by Transmission Line Impedance Measurement Basics 11 11 Calibration Concepts Calibration Concepts This section describes the basic concepts of OPE
247. he permittivity measurement This function doesn t set the electrical length When this softkey is selected the and keys lead only to the menus related to the permittivity measurement m PERMEABILITY 16454 Selects the permeability measurement When this softkey is selected the menu accessed from the SELECT FIXTURE softkey lists only magnetic material fixtures The and keys lead only to the menus related to the permeability measurement When a fixture size has been specified the size is displayed in parenthesis in the softkey label m SELECT FIXTURE Leads to the following softkeys which are used to select a test fixture for the permeability measurement LH FIXTURE 16454 S Sets the electrical length that is suitable for the 16454A Small Measurement Block 5 27 Magnetic Material Measurement mo 16454 L Sets the electrical length that is suitable for the 16454A Large 5 28 Measurement Block Magnetic Material Measurement Magnetic Material Size Menu Option 002 only MEAS INNER MATERIAL DIAMETER OUTER DIAMETER SIZE HEIGHT DONE MODIFIED Figure 5 23 Magnetic Material Size Menu Option 002 only m DUTER DIAMETER Sets outer diameter of magnetic material to be measured which is ring shaped m INNER DIAMETER Sets inner diameter of magnetic material to be measured which is ring shaped m HEIGHT Sets height of magnetic material to be measured which is ring shaped m D
248. hen the width value is 45 the cutoff points values are 45 Note a For more information on the width function see Width Function in Y the last part of this chapter Marker Block 7 17 Utility Menu MKR LIST ON off STATISTICS ON off SMTHIPOLAR MENU L IMAG LIN MAG PHASE LOG MAG Luu PHASE REX GEE SWR PHASE RETURN MKR X AXIS STIM E MKROCAXIS STIM TIME OE RETURN LEVEL MON OFF Ey MONITOR OFF ACM ACA DE 4 DCA RETURN CE007013 Figure 7 12 Utility Menu m MKH LIST on OFF Toggles the marker list function on and off This lists the stimulus values and measurement values of all markers In A mode this also lists Amarker m STATISTICS on OFF Calculates and displays the mean standard deviation and peak to peak values of the section of the displayed trace in the search range If Partial Search is orr the statistics are calculated for the entire trace The statistics are absolute values Statistics for Polar Smith and Admittance Chart Formats The statistics are calculated using the absolute value of the complex value A Convenient Use of Statistics The statistics function provides a convenient way to find the peak to p
249. ies Resistance Q b Imaginary Part JX V i Real part Figure 11 1 Definition of Impedance The following parameters can be used to represent the reactance X 2n L 11 5 Impedance Measurement Basics 11 3 Impedance Parameter Admittance Y 11 4 Impedance Measurement Basics Where f Frequency Hz L Inductance H In addition to these parameters the Quality Factor Q and Dissipation Factor D are used to describe the quality of components 1 x _ 11 6 Q 5 5 11 6 Where Q Quality Factor D Dissipation Factor In some case the dual of impedance Admittance Y is used Figure 11 2 shows the vector representation of admittance As Z Complex Impedance Y is composed of a real and an imaginary part and is expressed in rectangular form as Conductance and Susceptance or in polar form as magnitude of Admittance and Phase The following are expressions for Admittance 1 Y 11 7 j 11 7 Y G 4 jB Y Z 11 8 Y G B l 11 9 Z arctan 2 6 11 10 B 27fC 11 11 1 _ BI 57 11 12 1 11 1 E 11 13 Where Y Complex Admittance S G Conductance S real B Susceptance S imaginary Y Magnitude of Admittance S o Phase of Admittance deg or rad C Capacitance F R Parallel Resistance Q Reflection Coefficient T Impedance Parameter Imaginary Part jB 2 G gt Real
250. ify the axis scales and the reference line value Provides access to two different noise reduction techniques sweep to sweep averaging and on point averaging Provides access to a series of menus that implement the calibration and fixture compensation procedures For more information see Chapter 5 This block defines the sweep range and controls the trigger function test signal and DC bias source Cea Trigger Provides access to a series of menus used for selecting the sweep type editing the list sweep table specifying the number of points to be displayed and specifying the delay time Displays the menu used to control the test signal and DC bias Provides access to a series of menus used for selecting trigger mode and trigger source Start Stop Center and Used to specify frequency or power range of the stimulus For more information see Chapter 6 This block displays the marker on the screen and controls the marker function Marker Displays the marker and provides access to a series of menus used for selecting the marker mode and displaying the sub markers and the Amarker Provides access to a series of menus used for changing selected measurement parameters to the current maker value Displays menus used for searching the trace for a specific amplitude related point and placing the marker on that point Displays a menu used for listing all marker values calculating and displ
251. ight corner of the graticule for each displayed channel in units appropriate to the display format The displayed marker measurement values are valid even when the measured data is above or below the range displayed on the graticule When marker list is turned on stimulus values and measurement values of all markers are listed on the graticule In a polar Smith or admittance chart format auxiliary measurement values of all markers are also listed X axis Value to be Displayed 7 20 Marker Block Stimulus Value Normally the marker displays the stimulus value at the current marker position for the x axis value Time When time is selected as the x axis value to be displayed instead of the marker value the x axis is changed to the time scale The start point of the x axis is 0 seconds and the stop point indicates the sweep time Relaxation Time 1 27f When marker relaxation time 1 27f is selected as the x axis value to be displayed instead of the stimulus value the x axis is changed to the 1 27f scale Marker Level Monitor Marker Function The analyzer has the capability to monitor the output voltage or current level of the OSC level or de bias When the level monitor is turned on the level monitor value on a marker point is displayed on the screen The monitor value displayed is calculated from the current stimulus setting and the impedance value measured OSC level monitor value The voltage value of the OS
252. ike light during the operation E Instrument generates high temperature or electrical shock during operation B Power cable plug or receptacle on instrument is damaged WI Foreign substance or liquid has fallen into the instrument LED TL BL B EE U upnunaupnamnpnunuupnununnunugugunagmmnumnangmgaunsuu u gngumnaumnuggusgaggsnumnaupnamnpmungaugagnmnaggmiagggaulu ugaumnaugangunaumnaumnamnpaunaggguuuu uguali uggumnampmungaupngngmumuaunmagagmgagnmuintultlu uggumnammnaumnagmanmalinmulutut gumnampmungaupnapngmumnaggaguuut DOdo0000000000000 Herstellerbescheinigung GERAUSCHEMISSION LpA lt 70 dB am Arbeitsplatz normaler Betrieb nach DIN 45635 T 19 Manufacturer s Declaration ACOUSTIC NOISE EMISSION LpA lt 70 dB operator position normal operation per ISO 7779 Agilent Technologies innovating the HP Way Manufacturer s Name Manufacturer s Address Declares that the product Product Name Model Number Product Options Is in conformity with DECLARATION OF CONFORMITY According to ISO IEC Guide 22 and CEN CENELEC EN 45014 Agilent Technologies Japan Ltd Component Test PGU Kobe 1 3 2 Murotani Nishi ku Kobe shi Hyogo 651 2241 Japan RF Impedance Materia Analyzer 4291B All options and customized products based on the above EMC European Council Directive 89 336 EEC and carries the CE marking accordingly EMC Standards required by the Australia Radio Communications Act IEC 61326 1
253. inductor eBelow approx 10 Q Use series circuit model eAbove approx 10 kQ Use parallel circuit model eBetween above values Follow the manufacturer s recommendation Impedance Measurement Basics 11 9 Smith Chart Smith Chart This section provides a brief description of the Smith Chart for users who are not familiar with its use Figure 11 7 shows the Smith Chart plane of impedance coordinates On the Smith Chart plane the coordinate scales signify the impedance component quantities The circles tangent at point are the scales for which the resistance values R are constant The arcs that cross at point and intersect the circles at right angles are the scales for which reactance values X are constant X constant R constant Figure 11 7 Smith Chart These resistance and reactance scale values are the normalized values They are calculated by dividing the sample impedance Zx Rx jXx by the characteristic impedance Z 500 of the measuring circuit Therefore the normalized impedance R 4 jX is o Le Ry Xs E Rp jX Z 50 B0 11 17 A sample impedance value is represented on the Smith Chart as a point coordinated with the scales corresponding to its normalized impedance see Figure 11 8 The base impedance Zo characteristic impedance is located at the center of the Smith Chart plane The radius vector Zo Z represents the reflection coefficient value T 0 of the sample in this case t
254. ions are enabled EXTENSION VALUE Makes the port extension value the active function Used to add electrical delay in seconds to extend the reference plane at the APC 7 connector on a test head to the end of the cable For more information on the port extension see Port Extension in Chapter 11 Stimulus Block The stimulus block keys and associated menus provide control of the Sweep trigger and source functions The following list shows the functions controlled by each key in the stimulus block STIMULUS e e e E E ED EN 06006001 Figure 6 1 Stimulus Block Controlling delay time Specifying number of points to be measured Selecting sweep source Selecting sweep type and sweep direction Editing table for list sweep Selecting channel coupling Specifying output level of stimulus source Selecting OSC level unit Setting CW frequency for power sweep and de bias sweep Controlling de bias source Selecting trigger mode Selecting trigger source Selecting event caused by trigger Restarting measurement Setting start value of stimulus Setting stop value of stimulus Setting center value of stimulus Setting span of stimulus Stimulus Block 6 1 Functions accessed from this block You can access from See the following section in this chapter Channel Coupling Continuous sweep DC bias sweep DC bias Delay time sweep delay point delay External trigger Linear sweep
255. is softkey does not appear if the user trace display is turned on Marker M arker gt The Marker key activates the marker if it is not already active and provides access to the Marker functions The Marker functions change the stimulus and amplitude values to make them equal to the current marker value Use the knob or the numeric keypad to move the marker to the desired position on the trace and then press the appropriate softkey to set the specified parameters to that trace value When the values are changed the marker can again be moved within the range of the new parameters The Marker functions can select either channel 1 or 2 as the destination channel whose value will be changed by the performing the Marker functions Marker menu MKR gt CENTER MKR START MKR gt STOP Rx M REFERENCE MKR ZOOM PEAK gt CENTER CROSS CHAN on OFF MORE J MKR A gt SPAN MKR A gt CENTER ZOOMING APERTURE CROSS CHAN on OFF RETURN Figure 7 5 Marker Menu m MKR CENTER Changes the stimulus center value to the stimulus value of the marker and centers the new span about that value When the cross channel CROSS CHAN is turned off this softkey changes the center value of the active channel When the cross channel is turned on this softkey changes the parameter of the inactive channel m MKR START Changes the stimulus start value
256. isplay according to the selected format These formats are often easier to interpret than the complex number representation Polar Smith admittance chart and complex plane formats are not affected by the scalar formatting Data Math This calculates the complex ratio of the two data memory the difference data memory summation data memory or multiplication datax memory when the data math function is selected In addition this function multiplies the ratio or difference by a constant Data Trace Arrays The results are stored in the data trace arrays It is important to note those marker values and marker functions are all derived from the data trace arrays Limit testing is also performed on this array The data trace arrays are accessible via GPIB or using the floppy disk drive or the memory disk Memory Trace Arrays If the data to memory operation is performed the data trace arrays are copied into the memory trace arrays data arrays are also copied into the memory array at same time These arrays are accessible using the floppy disk drive or the memory disk These arrays are also output via GPIB but data cannot be input into these arrays via GPIB Scaling These operations prepare the formatted data for display on the LCD This is where the appropriate reference line position reference line value and scale calculations are performed See Scale Ref in Chapter 5 in this chapter 10 Options and Access
257. isplays the Color Adjust menu O IBASIC Selects the text on the BASIC screen for color modification and displays the Color Adjust menu MORE in this menu displays softkeys to select a numbered pen for color modification The pens are used by the HP Instrument BASIC graphic commands O PEN 1 Selects pen 1 for color modification and displays the Color Adjust menu O PEN 2 Selects pen 2 for color modification and displays the Color Adjust menu O PEN 3 Selects pen 3 for color modification and displays the Color Adjust menu O PEN 4 Selects pen 4 for color modification and displays the Color Adjust menu O PEN 5 Selects pen 5 for color modification and displays the Color Adjust menu O PEN 6 Selects pen 6 for color modification and displays the Color Adjust menu m DEFAULT COLORS Returns all the color settings back to the default values m S VE COLORS Saves the modified version of the color set to the non volatile memory m RECALL COLORS Recalls the previously saved modified version of the color set from the non volatile memory RECALL COLORS appears only when a color set has been saved Measurement Block 5 43 Color Adjust Menu Display CHT DATA CHT MEM Y LIMIT EN MORE GHZ DATA x CHZMEM EDU LIMIT LN TINT Y GRATICULE BRIGHTNESS MODIFY COLORS COLOR RESET BASIC
258. ity menu Marker Sub marker Marker Marker Menu Marker list Utility Utility menu Marker time Utility Utility menu Marker function Marker Marker menu Mean value Utility Utility menu Partial search Search Search range menu Peak definition Search Peak definition menu Peak search MAX MIN search and target search Search Search menu Peak to peak Utility Utility menu Relaxation time Utility Utility menu Smith polar maker Pz Ty R jX G jB Utility Utility menu Standard deviation Utility Utility menu Zooming traces Marker Marker menu For Additional Information on See Preset values and Setting Range of each function setting value Appendix B in this manual All Softkey Trees Appendix C in this manual GPIB Command Reference GPIB Command Reference in the Programming Manual How to control the 4291B using an external controller or the HP Programming Manual Instrument BASIC capability through the GPIB Note i The marker function is summarized in the last section of this chapter Y 7 2 Marker Block Marker Marker _ Markor sup MKR a SUB MKR A MKR SUB MKR FIXED AMKR PRESET TRACKING MKRS AMKR MKR ON AMKR OFF DATA AMKR MKR STIMULUS IUNCOUPLE FIXED MKR MKR VALUE CONT FIXED MKR AMODE MENU AUX VALUE RETURN Marker Menu Delta Marker Menu
259. ive channel block If dual channel is oN with an overlaid display both chan 1 channel 1 and chan 2 channel 2 appear in this area 2 4 Front and Rear Panel Test Station and Test Heads 2 Measured parameter 3 Scale Div 4 Reference Level 5 Marker Data Readout Shows the measurement parameter selected using the Meas key Displays the scale set by the Scale Ref key in units appropriate to the current measurement or displays top and bottom value of the graticule When polar Smith chart or admittance chart formats are selected this area displays Fscl and the value of the outer circle Fscl stands for full scale Displays the value of a reference line in Cartesian formats It is selected using the key However the reference line is invisible it is indicated by a small triangle adjacent to the graticule at the left The reference levels of the complex plane format are not displayed When TOP VALUE and BOTTOM VALUE are used for scaling traces these values are displayed in the area of 3 Scale Div and 4 Reference Level with T amp B T amp B stands for top and bottom Displays the values of the marker in units appropriate to the current measurement see Chapter 7 The status of the marker is also displayed under the marker values The following status notations are used Cpl Marker couple is tuned on When single channel is displayed this notation is not displayed even if the marker coup
260. k turning beeper on off controlling and making limit line and executing limit testing Local key section describes the capability to control GPIB Copy key section describes making hard copy of the LCD image or listing measurement value or the analyzer setting Save and Recall section describes the storage capability of analyzer and also provides the information on file structure to be saved in a disk Chapter 9 Analyzer Features Chapter 10 shows analyzer s simplified block diagram and explains the data processing flow in the analyzer Chapter 10 Options and Accessories Available Chapter 10 provides the information on the options and accessories available Chapter 11 Measurement Basic Chapter 11 provides basic theory for impedance and material measurements Chapter 12 4291B RF Impedance Material Analyzer Specifications Chapter 12 provides the specification of the 4291B Appendix A Manual Changes Appendix A contains the information required to adept this manual to earlier version or configurations of the analyzer than the current printing date of this manual Appendix B Input Range and Default Settings Appendix B lists input ranges preset values when Preset key is pressed or the analyzer receives RST command through GPIB and power ON default setting Appendix C Temperature Coefficient Measurement Appendix C describes a high temperature test head a high temperature fixture and temperature coefficient me
261. l 2 6 11 Instrument BASIC Status Run Light e 2 6 12 Stimulus Span Stop Value 2 6 13 CW Frequency a 2 6 14 Stimulus Center Start Value 2 6 15 OSC Level 2 6 16 Status Notations 1 1 2 7 17 Equivalent Circuit Parameters 2 7 18 External Reference 2 7 19 Active Entry Area 2 8 20 Message Area 24 2 8 21 Title F 2 8 Rear Panel Features and Connectors 2 2 9 Contents 1 Contents 2 External Reference Input Sl Internal Reference Output External Program RUN CONT Input LOPort 0 2 Power 2 25 2 5 2 6 GPIB Interface 7 mini DIN Keyboard Connector 8 External Trigger Input 2 2 2 9 Reference Oven Output Option 1D5 Only 10 Video Port 11 Printer Port Nu NA DO Port Test Station l Cable L l 2 2 Test Fixture Mounting Posts D 3 Test Fixture Mounting Screws 2 2 A Test Head Connectors 5 Heat Sink 1 11 6 Test Station Mounting Screws Test Heads 2 2 2 2 2 2 2 2 5 5 1 Connectors 1 11 2 APC 7 Connector 3 Knobs 4 2 High Impedance Measurement Test Head L
262. l key in the Operation Manual NO COMPENSATION CURRENTLY IN PROGRESS The RESUME COMP SEQ softkey No GPIB command is not valid unless a fixture compensation is in progress Start a new calibration See Cal key in the Function Reference NO DATA TRACE The MARKER ON DATA CALCulate EVALuate 0N1 TR1 is selected when the data trace is not displayed NO DATA TRACE DISPLAYED The SCALE FOR DATA DISPlay WINDow TRACe1 Y SCALe is selected when the data trace is not displayed No error The error queue is empty Every error in the queue has been read SYSTem ERRor query or the queue was cleared by power on or the CLS command NO FIXED DELTA MARKER The Amarker cannot move AMKR STIMULUS FIXED AMKR VALUE or FIXED A AUX VALUE CALCulate EVALuate REFerence X Y1 Y2 lt numeric gt cause the error because m The Amarker is not turned on Turn the Amarker ON DISPlay WINDow TRACe MARKer RELative ON m The only fixed Amarker can move by FIXED AMKR VALUE or FIXED A AUX VALUE Press FIXED AMKR DISPlay WINDow TRACe MARKer RELative REFerence FIXed NO MARKER DELTA RANGE NOT SET The MKRA SEARCH RNG softkey CALCulate EVALuate BAND SPAN DMARker requires that Amarker is turned ON 09 08 75 30 Temperature Coefficient Measurement NO MARKER DELTA SPAN NOT SET The MKRA SPAN softkey SENSe FREQuency SPAN DMARker or SOURce 1 2 VOLTage CURRent SPAN DMARker
263. l Measurement m MORE 1 6 leads the following softkeys which is used to masure impedance parameter as same as the Impedance Measurement menu o IMPEDANCE MAG Z Measures absolute magnitude value of impedance Z O PHASE z Measures phase value of impedance O RESIST R Measures resistance value R O REACT X Measures reactance value X ADMITTNCE MAGCIYI Measures absolute magnitude value of admittance Y PHASE C y Measures phase value of admittance 6 CONDUCT G Measures conductance value G SUSCEPT B Measures susceptance value B O REFL COEF MAGCITI Measures absolute magnitude value of reflection coefficient T O PHASECOT Measures phase value of reflection coefficient 0 O REAL I x Measures real part of reflection coefficient T IMAG T y Measures imaginary part of reflection coefficient Ty m CAPCITNCE PRL Cp Measures parallel capacitance Cp which is used for small capacitance measurement m SER Cs Measures series capacitance C which is used for large capacitance measurement m INDUCTNCE PRL Lp Measures parallel inductance Lp which is used for large inductance measurement m SER Ls Measures series inductance L which is used for small inductance measurement a RESISTNCE PRL Rp Measures parallel resistance Rp which is used for large resistance large inductance or small capacitance 3 SER Rs Measures series resistance Rs which is used for
264. le is on Peak PEAK search tracking is turned on Max MAX search tracking is turned on Min MIN search tracking is turned on Targ TARGET search tracking is turned on 6 Level Monitor Marker Statistics and Width Value 7 Softkey Labels 8 Pass Fail Displays the level monitor value the statistical marker values determined by using the menus accessed with the key and the width value determined by using the menus accessed with the key See Chapter 7 Displays the menu labels that define the function of the softkeys immediately to the right of the label Indicates the values used for limit testing when using limit lines See Limit Line Concept in Chapter 8 Front and Rear Panel Test Station and Test Heads 2 5 9 DC BIAS ON notation 10 DC Bias Level When dc bias is turned on DC BIAS ON is displayed in this area This notation is not display when the screen displays user trace Displays the dc bias level and limit value of the dc bias when it is turned on The do bias limit level is displayed in brackets 11 Instrument BASIC Status Run Light Shows current status of Instrument BASIC Li blank Program stopped can execute commands CONTINUE not allowed Program paused can execute commands CONTINUE is allowed BASIC program waiting for input from keyboard cannot execute commands This indication has two possible meanings m Program running CANNOT execute BASIC commands CONTINUE not allo
265. ling function see the table after Figure 6 4 m SWEEP MENU Leads to the following softkeys which are used to select sweep source and sweep type C SWP SRC EREQ Selects frequency sweep OSC LEVEL Selects OSC level sweep J DC V Selects dc bias voltage sweep Option 001 only DC I Selects dc bias current sweep Option 001 only SWEEP TYPE LINEAR Selects linear sweep 4 LOG Selects Logarithmic sweep mode The source is stepped in logarithmic increments and the data is displayed on a logarithmic graticule If the sweep range includes zero the sweep type is automatically changed to linear O LIST Selects list frequency sweep If a list is not defined this softkey performs no function m SWEEP DIR Toggles direction of sweep between up and down When DOWN is selected the analyzer sweep starts from the stimulus STOP value and sweeps to the START value DOWN is only available for the OSC level dc voltage and dc current sweep The down sweep is not available for frequency sweep LIST MENU Leads to the List menu which is used to control the list sweep and define the list sweep table Figure 6 4 shows the relationship between delay time and sweep time The sweep delay time is not included in the sweep time The summation of all point delay times is added to the sweep time When both the sweep delay time and the point delay time are set the analyzer starts the sweep after waiting for both of sweep delay time and poi
266. ly on the trace If the delta marker is the tracking Amarker its stimulus value can be controlled and its measurement value is the value of the trace at that stimulus value Marker Block 7 21 Marker Function Marker Search Function Width Function 7 22 Marker Block Markers can search for the trace maximum minimum any other point peak maximum minimum or peak to peak value of all or part of the trace The marker and sub markers can be used together to search for specified width cutoff points and calculate the width and Q Statistical analysis uses markers to provide a readout of the mean standard deviation and peak to peak values of all or part of the trace When the format is polar Smith admittance chart or complex plane format the marker search function searches for the primary marker value not the AUX value of the point specified Applications for Marker Search on Complex Plan To search for the maximum absolute value of the complex impedance l Press Utility SMTH POLAR MENU LOG MAG PHASE 2 Press Search MAX To search for the maximum real part value of the complex impedance l Press Utility SMTH POLAR MENU REAL IMAG 2 Press Search MAX To search for the maximum resistance value R of the complex impedance 1 Press Utility SMTH POLAR MENU R 3X 2 Press Search MAX The width search feature analyzes a resonator and calculates the center point width and quality factor Q for the spe
267. mation the supplement may contain information for correcting errors Errata in the manual To keep this manual as current and accurate as possible Agilent Technologies recommends that you periodically request the latest MANUAL CHANGES supplement For information concerning serial number prefixes not listed on the title page or in the MANUAL CHANGE supplement contact the nearest Agilent Technologies office Turn on the line switch or execute the IDN command by GPIB to confirm the firmware version See the Programming Manual manual for information on the IDN command Table A 1 Manual Changes by Serial Number Serial Prefix or Number Make Manual Changes Table A 2 Manual Changes by Firmware Version Version Make Manual Changes Manual Changes A 1 Serial Number Agilent Technologies uses a two part ten character serial number that is stamped on the serial number plate see Figure A 1 attached to the rear panel The first five characters are the serial prefix and the last five digits are the suffix Agilent Technologies Japan Ltd SER NO JP1KG12345 AK MADE IN JAPAN 33 Figure A 1 Serial Number Plate A2 Manual Changes Input Range and Default Setting When the key is pressed or the analyzer is turned ON the analyzer is set to a known state There are subtle differences between the preset state and the power up state Some power up states are
268. mit testing is ON and the fail beeper is oN a beep is emitted each time a limit test is performed and a failure is detected EDIT LIMIT LINE Displays a table of limit segments on the lower half of the display Also leads to the following softkey which is used to define or change limits D SEGMENT Specifies which limit segment in the table to edit The list can be scrolled up or down to show other segment entries The pointer shows the segment that can be edited or deleted The pointer can be moved using the entry block If the table of limits is designated EMPTY new segments can be added using ADD or EDIT HJ EDIT Displays the Limit Line Entry menu that defines or modifies the stimulus value and limit values of a specified segment If the table is empty a default segment is displayed O DELETE Deletes the segment indicated by the pointer gt 3 ADD Displays the Limit Line Entry menu and adds a new segment to the end of the list The new segment is initially a duplicate of the segment indicated by the pointer and selected using SEGMENT If the table is empty a default segment is displayed The maximum number of segments is 18 O CLEAR LIST Displays the following softkeys and clears all the segments in the limit test m CLEAR LIST YES Clears all the segments in the limit line table and returns to the previous menu m NO Cancels clearing the segments and returns to the edit limit menu c DONE Sorts the limit segments
269. mperature lt 40 C Using with 16453A or 16454A See Table 12 5 and Table 12 6 40 V E 500 mA 55 C to 200 C up to 95 RH Table 12 5 Applicable Dielectric Material Size Using with 16453A s i t lt 3 mm Ll ri d gt 615mm Table 12 6 Applicable Magnetic Material Size Using with 16454A Fixture Small Large Holder A B C D lt 8mm x66 mm lt 20mm 20mm 263 1 mm 63 1 mm gt 66mm gt 5 mm h lt 3mm lt 3mm lt lOmm lt 10mm 12 38 4291B RF Impedance Material Analyzer Technical Data Material Measurement Accuracy with High Temperature Test Head Option 002 Material Measurement Accuracy with Option 013 and 014 High Temperature Test Head Typical Dielectric Material Measurement Accuracy with High Temperature Test Head Typical Conditions of Dielectric Material Measurement Accuracy with High Temperature Test Head m Environment temperature is within 5 C of temperature at which calibration is done and within 0 C to 40 C High Temperature High Impedance Test Head must be used Bending cable should be smooth and the bending angle is less than 30 Cable position should be kept in the same position after calibration measurement OPEN SHORT 50 Q calibration must be done Calibration ON Measurement points are same as the calibration points Averaging on point factor must be larger than 32 at which calibration is done
270. mplify DUT connection Espec Temperature Chamber SU 241 is designed to integrated easily with 4291B m GPIB as standard m Measuring Port eliminating the needs to create additional measurement cables access hole The high temperature test head 16194A 16453A and 16454A has the capability for 55 C to 200 C temperature measurement in environmental testing Use globes to prevent scalding when handling heated parts Option 013 014 Temperature Coefficient Measurement C 1 Temperature Coefficient Measurement Setup and Installation Guide This section provides the information necessary to set up your analyzer and temperature chamber Required Equipment To perform all the steps in this quick start the following equipment is required m 4291B RF Impedance Material Analyzer m mini DIN Keyboard Test Head o High Temperature High impedance Test Head option 013 or o High Temperature Low impedance Test Head option 014 Fixture Stand Agilent PN 04291 60121 included with option 013 or 014 m Pad Agilent PN 04291 09001 included with option 013 or 014 Calibration Kit included with 4291B Test Fixture o 16194A High Temperature SMD Fixture or o 16453A Dielectric Material Test Fixture or o 16454A Magnetic Material Test Fixture Chamber Espec Chamber SU 241 m Blank Diskette ZHD is recommended Agilent PN 9164 0299 Equipment Setup Figure C 1 shows the equipment setup
271. mum number of segments for the limit line table is 18 TOO MANY SEGMENTS OR POINTS Frequency list mode is limited to 15 segments or 801 points Too much data A legal program data element of block expression or string type was received that contained more data than the analyzer could handle due to memory or related device specific requirements TOO MUCH DATA GPIB only Either there is too much binary data to send to the analyzer when the data transfer format is binary or the amount of data is greater than the number of points TOO SMALL POINTS OR TOO LARGE STOP STOP SPAN NOP 1 is out of sweep range Increase NOP or change STOP value to lower frequency to avoid this error TRD ISOL N I TO V TEST FAILED An external test 28 TRD ISOL N I TO V fails See the Service Manual for troubleshooting TRD ISOL N V TO I TEST FAILED An external test 29 TRD ISOL N V TO I fails See the Service Manual for troubleshooting TRD LOSS TEST FAILED An external test 22 TRD LOSS fails See the Service Manual for troubleshooting Trigger error A trigger related error occurred This error message is used when the analyzer cannot detect the more specific errors described for errors 211 through 219 Trigger ignored A GET TRG or triggering signal was received and recognized by the analyzer but was ignored because of analyzer timing considerations For example the analyzer was not ready to respon
272. n as double dotted line boxes These arrays are not accessible via GPIB but showing them may help you better understand the behavior of the instrument Note a While only a single flow path is shown two identical paths are Y available that correspond to channel 1 and channel 2 When the channels are uncoupled each channel can be independently controlled so that the data processing operations for one can be different from the other 9 2 Analyzer Features Data Processing Data Processing Flow DIGITAL POINT FLITER AVERAGING CAUBRATION COEFFICIENT INTERPOLATION Y CALIBRATION COEFFICIENT ARRAYS 1 33 ERROR CORRECTION Y FIXED POINT 7 USER DEFINED 2 USER DEFINED ERROR POINT ERROR 7 So FXTURE 7 POINT FIXTURE CORRECTION t CORRECTION a k COMPENSATION t COEFFICIENT u COEFICIENT 4 DOS ARRAYS a 1 ARRAYS COMPENSATION COEFFICIENT INTERPOLATION Y FIXTURE COMPENSATION ARRAYS DATA ARRAYS Y DATA gt MEM CONVERSION SWEEP PORT FIXTURE MEMORY AVERAGING EXTENSION COMPENSATION ARRAYS FORMAT Remarks Izl lvl e ROLE Fr FL SCALING ere Hr pr GSP INTERFACE
273. n combination with other keys to enter or change numeric data For more information see Chapter 4 This block controls the measurement and display functions Each key provides access to softkey menus Because the measurement functions are different for impedance permittivity e and permeability y measurements the menus accessed from the and Cal keys are different for each measurement of operation Provides access to a series of menus used to select the parameters to be measured This menu is also used to select fixtures to be used for material c and y measurements Forma Displays the menu used to select the display format of the data Various rectangular and polar formats are available STIMULUS Block STIMULUS free ere Trigger Start Stop Center Span MARKER Block MARKER Marker j ps esren oy Scale Ref Bw Avg for display of measurement parameters selected by Meas key Provides access to a series of menus used for instrument state and active channel display functions These menus include dual channel display overlaid or split definitions of the displayed active channel trace in terms of the mathematical relationship between data and trace memory display intensity color selection active channel display title frequency blanking and equivalent circuit function Displays the menu used to mod
274. n provided by the equipment In addition it violates safety standards of design manufacture and intended use of the instrument The Agilent Technologies assumes no liability for the customer s failure to comply with these requirements 4291B comply with INSTALLATION CATEGORY II and POLLUTION DEGREE 2 in IECI010 1 4291B are INDOOR USE product LEDs in 4291B are Class 1 in accordance with IEC825 1 CLASS 1 LED PRODUCT To avoid electric shock hazard the instrument chassis and cabinet must be connected to a safety earth ground by the supplied power cable with earth blade DO NOT Operate In An Explosive Atmosphere Do not operate the instrument in the presence of flammable gasses or fumes Operation of any electrical instrument in such an environment constitutes a definite safety hazard Keep Away From Live Circuits Operating personnel must not remove instrument covers Component replacement and internal adjustments must be made by qualified maintenance personnel Do not replace components with the power cable connected Under certain conditions dangerous voltages may exist even with the power cable removed To avoid injuries always disconnect power and discharge circuits before touching them DO NOT Service Or Adjust Alone DO NOT Substitute Parts Do not attempt internal service or adjustment unless another person capable of rendering first aid and resuscitation is present Or Modify Instrument Because of the
275. nal test 12 A6 3RD LO OSC fails The 3rd LO OSC third local oscillator on the A6 receiver IF does not work properly See the Service Manual for troubleshooting A3 DIVIDER OUTPUT FREQUENCY OUT OF SPEC An internal test 11 A3A1 DIVIDER fails The output frequency of the divider circuit on the A3A1 ALC is out of its limits See the Service Manual for troubleshooting A6 GAIN TEST FAILED An external test 23 A6 GAIN fails See the Service Manual for troubleshooting A6 VI NORMALIZER TEST FAILED An external test 24 A6 VI NORMALIZER fails See the Service Manual for troubleshooting Messages 1 Temperature Coefficient Measurement Messages 2 6 240 ADDITIONAL STANDARDS NEEDED Error correction coefficients cannot be computed until all the necessary standards have been measured Execute all OPEN SHORT LOAD calibration SENSe CORRectioni COLLect ACQuire STAN1 STAN2 STAN3 before press DONE CAL SENSe CORRection1i COLLect SAVE BACKUP DATA LOST Data checksum error on the battery backup memory has occurred The battery is recharged for approximately 10 minutes after power was turned on Block data error This error as well as errors 161 and 168 are generated when analyzing the syntax of a block data element This particular error message is used if the analyzer cannot detect a more specific error Block data not allowed A legal block data element was encountered but was
276. nd the user trace Cl DATA USER Stores the active measurement data in the user trace selected and copies the unit and NOP of the data trace to the user trace selected c MEMORY USER Stores the active memory data in the user trace selected and copies the unit and NOP of the memory trace to the user trace selected ci SELECT UTRC 1 Leads to the following softkeys which are used to select one user trace from the four traces available in order to copy data or memory trace to the user trace You can read the value of the trace using the marker and scale the trace m USER TRC 1 Selects user trace number 1 M USER TRC 2 Selects user trace number 2 Measurement Block 5 47 5 48 Measurement Block M USER TRC 3 Selects user trace number 3 M USER TRC 4 Selects user trace number 4 SEL D UTRC ON off Sets the state of the selected user trace to display it ON or to erase it OFF The trace is not displayed when the trace is unselected after the state was set to OFF The state of each user trace can be set ON and OFF individually O CLEAR ALL UTRC Clears all user trace data and settings and turns off the user trace display m MORE Leads the following softkey menu I LABEL MENU Leads to the Label menu which is used to label text on any area of the screen USER TRACE LABEL Displays the following softkeys which are used to put characters on the top or bottom area or to enter the x and y axis unit labels of the user
277. nel 1 or 2 using marker functions turn off the channel coupling If the channel coupling COUPLED CHAN is on a marker functions always changes the settings of both channels The active channel is NOT changed to the destination channel after a Marker function is performed even when the cross channel is turned on The cross channel can be turned on when the dual channel is turned on Marker Block 7 9 SEARCH 1 The Search key activates the marker if it is not already active and provides access to the marker search functions The marker search functions can quickly search the trace for specified information MIN TARGET TARGET A SEARCH LEFT SEARCH RIGHT PEA SRCH TRACK ON off WIDT SUBMKRH Y OFF SEARCH RANGE MENU Search Menu CE007006 7 10 Marker Block SEARCH IN dum OUT WIDTH on OFF WIDTH VALUE Y X MKRVAL 2 MKRVAL 2 MKRVAL 2 FIXED RETURN RETURN Width Menu PART SRCH ON off MKRA gt SEARCH RNG MKR gt LEFT RNG MKR gt RIGHT RNG RETURN Search Range Me
278. nels or they can be uncoupled for independent control in each channel See Chapter 7 for more information about markers Entry Block The ENTRY block Figure 4 1 contains the numeric and unit s keypad the knob and the step keys These controls are used in combination with other front panel keys and softkeys to modify the active entry to enter or change numeric data and to change the value of the marker In most cases the keypad knob and step keys can be used interchangeably Before a function can be modified it must be made the active function by pressing a front panel key or softkey It can then be modified directly with the knob the step keys or the digits keys and a terminator Numeric Keypad Units Terminater Keys Step Keys Entry Off Key i i Entry Back i off Space J 1 Back Space Key Figure 4 1 Entry Block Entry Block 4 1 Numeric Keypad Terminator Keys Knob D and W 4 2 Entry Block The numeric keypad selects digits decimal point and minus sign for numerical entries A unit s terminator is required to complete the entry The unit s terminator keys are the four keys in the right hand column of the keypad These specify units of numerical entries from the keypad and also terminate the entries A numerical entry is incomplete until a terminator is entered
279. ng On Sweep and Averaging On Points Averaging On Sweep Averaging on sweep computes each data point based on an exponential average of consecutive sweeps weighted by a user specified averaging factor Each new sweep is averaged into the trace until the total number of sweeps is equal to the averaging factor for a fully averaged trace Each point on the trace is the vector sum of the current trace data and the data from the previous sweep A high averaging factor gives the best signal to noise ratio but slows the trace update time Doubling the averaging factor reduces the noise by 3 dB The algorithm used for averaging on sweep is Sn An p 1 p X n 1 Where A w current average S n current measurement F average factor Averaging On Points Averaging on points averages each data point by a user specified averaging factor The analyzer repeats measuring the same point until the averaging factor is reached It then divides the vector summation of measurement value by the averaging factor and starts measuring the next point The sweep time increases in proportion to the averaging factor The algorithm used for averaging on points is 1 F uso n 1 Where M Measurement Result Str current measurement F average factor Measurement Block 5 53 CAUBRATE Fixture IMPEDANCE MEM BUE Fixture PERMITTIVITY MENU I y OPEN Fixture PERMEABILITY BEEN
280. ng the x axis LOG Selects logarithm scale along the x axis Measurement Block 5 31 Display DUAL CHAN ON off SPLIT DISP ON off DISPLAY ALLOCATION ALL INSTRUMENT I HALE INSTR DEFINE TRACE E DISPLAY DATA MEMORY DATA and MEMORY MEMORY DATA gt SELECT EMORY NO SE LD MEM on ORE MEMORIES CLEAR RETURN HALE BASIC ALL BASIC I BASIC STATUS GRAPHICS BASIC DRAW l ALL MEMORY TRACE RETURN Display Allocation Menu Ey DATASMEM THLE DATA MATH DATA DATA MEM DATA MEM DATAIMEM DATAXMEM GAIN OFFSET MENU Y DEFAULT GAINSOFS OFFSET GAIN E MKR S OFFSET OFFSET AUXOFESET RETURN RETURN RETURN LABEL MENU ON off DISPLAY ADJUST FREQUENCY BLANK RETURN Display Menu CE005017 5 32 Measurement Block INTENSITY BACKGROUND INTENSITY MODIF COLORS Y CHI DATA
281. nstant V constant V constant Trigger Function Range Preset Value Power ON Factory default Setting Sweep Hold Single Number of group Continuous Continuous Continuous Number of Groups 1 to 999 Trigger Free run External GPIB Manual Free run Free run Trigger event ON SWEEP ON POINT On Sweep On Sweep Trigger polarity Positive Negative Positive Positive B 8 Input Range and Default Setting Start Stop Center Span Marker E E Ea E Function Range Preset Value Power ON Factory default Setting Start Frequency 1 MHz to 1 8 GHz 1MHz 1MHz Osc level 200uV to 1 V 200 uV 200 uV DC V 40 V to 40 V OV OV DC I 100 mA to 100 mA OA OA Stop Frequency 1 MHz to 1 8 GHz 1 8 GHz 1 8 GHz Osc level 2004V to 1 V 1V 1V DC V 40 V to 40 V OV OV DC I 100 mA to 100 mA OA OA Center Frequency 1 MHz to 1 8 GHz 900 5 MHz 900 5 MHz Osc level 2004V to 1 V 500 1 mV 500 1 mV DC V 40 V to 40 V OV OV DC I 100 mA to 100 mA OA OA Span Frequency 0 to 1 799 GHz 1 799 GHz 1 799 GHz Osc level 0 to 999 8 mV 999 8 mV 999 8 mV DC V 0 to 80 V OV OV DC I 0 to 200 mA OA OA m Function Range Preset Value Power ON Factory default Setting Trace using markers Data Memory 1 to 16 Data Data User trace 1 to 4 Marker coupling Coupling Uncoupling Coupling Coupling Marker cont discont Conti
282. nt Menu Option 002 only m PRMITTVTY REAL Measures effective relative permittivity e r m LOSS FACTR er Measures relative dielectric loss factor e LOSS TNGNT tan Measures dielectric dissipation factor dielectric loss tangent tan m MAG Measures absolute magnitude value of permittivity e MORE 1 6 leads the following softkeys which is used to masure impedance parameter as same as the Impedance Measurement menu Measurement Block 5 17 Dielectric Material Measurement O IMPEDANCE MAG Z Measures absolute magnitude value of impedance Z O PHASE z Measures phase value of impedance 0 O RESIST R Measures resistance value R D REACT X Measures reactance value X m ADMITTNCE MAGCIYI Measures absolute magnitude value of admittance Y m PHASE y Measures phase value of admittance 6 CONDUCT G Measures conductance value G SUSCEPT B Measures susceptance value B DUAL REFL COEF MAGCITI Measures absolute magnitude value of reflection coefficient T PHASECOT Measures phase value of reflection coefficient 0 REAL Ix Measures real part of reflection coefficient Tx IMAG T y Measures imaginary part of reflection coefficient Ty m CAPCITNCE PRL Cp Measures parallel capacitance Cp which is used for small capacitance measurement m SER Cs Measures series capacitance C which is used for large capacitance measuremen
283. nt delay time 1 Sweep Delay Point Delay Measuring Point Delay Measuring Time Time Time Time Time A K Sweep Time Trigger O point of Marker Time Scale Figure 6 4 Sweep Delay Time and Point Delay Time Stimulus Block 6 5 Parameters that are coupled or uncoupled by stimulus channel coupling If the stimulus is coupled the following parameters are coupled Frequency OSC Level dc Bias Delay Time Sweep Source Sweep Type Sweep Direction Number of Points Trigger Mode Correction Compensation Calibration Coefficients Define Trace Averaging on off factor Limit Test on off OSC Level Unit The following parameters are The following parameters are always common to both channels always set separately for each even if the stimulus is not channel even if the stimulus is coupled coupled List Sweep Table Measurement Parameter Trigger Source Format Trigger Event Scale Port Extensions Fixture Selection Port Extension Beep Off Pass Fail Frequency Blank Graticule on off Level Monitor Limit Line Use USER DEFINED calibration points for stable dc bias sweep measurements To oe ow NR calibration point Set NOP to 2 points Set START frequency to CW frequency Select USER DEF POINTS as the calibration points Perform OPEN SHORT and LOAD calibration measurements After calibration measurement select
284. nu SUB MKR 1 RETURN RETURN Target Menu PEAK NEXT PEAK NEXT PEAK LEFT NEXT PEAK RIGHT PEAK DEF MENU Y THRESHOLD ON off THRESHOLD VALUE MKR THRESHOLD PEAK PLRTY POS neg PEAK DEF AX PEAK DEF AY MKR PEAK DELTA RETURN SUB MKR y SUB MKR1 RETURN Peak Menu Figure 7 6 Softkey Menus Accessed from the Search Key Search Menu eei SEARCH MAX MIN TARGET Target Menu PEAK Peak Menu SRCH TRACK N off Width Menu WIDTH OFF Search Range SEARCH Menu RANGE MENU Figure 7 7 Search Menu m SEARCH MAX Moves the marker to the maximum amplitude point on the trace MIN Moves the marker to the minimum amplitude point on the trace TARGET Moves the marker to a specified target point on the trace and displays the Target menu that is used to search right or left to resolve multiple solutions PEAK Moves the marker to the maximum or minimum peak and displays Peak menu that is used to search for the next peak The search function searches for a peak that meets the peak definition specified in t
285. nuous Discontinuous Continuous Continuous Amarker mode ON OFF OFF OFF Fixed Amarker stimulus value START to STOP Fixed Amarker value 1x10 to 1x10 Fixed Amarker AUX value 1x10 to 1x10 Input Range and Default Setting B 9 Marker Search Utility Function Range Preset Value Power ON Factory default Setting Zooming aperture 0 to 100 96 10 of span 10 of span Cross channel ON OFF OFF OFF m Function Range Preset Value Power ON Factory default Setting Width ON OFF OFF OFF Width value Fixed MKRVAL 2 MKRVAL 2 Fixed Fixed MKRVAL 2 Fixed width value 100x106 to 100x 106 3 3 Threshold ON OFF OFF OFF Threshold value 100x 10 to 100x 106 100 100 Peak polarity Positive Negative Positive Positive Peak definition Ax Frequency 0 to 8x 10 10 MHz 10 MHz OSC level 0 to 8 8 8 DC V 0 to 80 80 80 DC I 0 to 0 8 0 8 0 8 Peak definition Ay 0 to 100x 106 1 1 Search tracking ON OFF OFF OFF Partial search ON OFF OFF OFF Target value 100x 107 to 100x107 3 3 Utiity Function Range Preset Value Power ON Factory default Setting Marker list ON OFF OFF OFF Statistics ON OFF OFF OFF Marker sweep parameter unit Stimulus Time 1 27f Stimulus Stimulus Smith polar marker Real imaginary Lin magnitude phase Log magnitu
286. oltmeters counters and tape readers The analyzer is a talker when it sends trace data or marker information over the bus Listener A listener is a device capable of receiving device dependent data when addressed to listen There can be any number of active listeners at any given time Examples of this type of device are printers power supplies and signal generators The analyzer is a listener when it is controlled over the bus by a computer Controller GPIB Function A controller is a device capable of managing the operation of the bus and addressing talkers and listeners There can be only one active controller at any time Examples of controllers include desktop computers and minicomputers In a multiple controller system active control can be passed between controllers but there can only be one system controller that acts as the master and can regain active control at any time The analyzer is an active controller when it plots or prints in the addressable mode The analyzer is a system controller when it is in the system controller mode GPIB Requirements Number of Interconnected Devices 15 maximum m Interconnection Path Maximum Cable Length 20 meters maximum or 2 meters per device whichever is less Message Transfer Scheme Byte serial bit parallel asynchronous data transfer using a 3 line handshake system m Data Rate Maximum of 1 megabyte per second over limited distances with tri state drivers Actual da
287. on Cal Calibration menu Calibration Cal Calibration menu Complex plan format Format Format menu Display adjust Color adjust Display Display menu Dual parameter setting Meas Measurement menu Equivalent circuit Display Display menu Fixture compensation Cal Calibration menu Frequency Blank Display Display menu Linear rectangular format Format Format menu Log rectangle format Format Format menu Material measurement Meas Fixture menu Measurement parameter selection Meas Impedance Measurement Menu Memory trace Display Display menu OPEN SHORT or LOAD definition for fixture Cal Calibration menu compensation Polar chart format Format Format menu Scaling trace Scale Ref Scale menu Smith chart format Format Format menu Single parameter setting Meas Measurement menu Split display and override Display Display menu Test fixture selection Meas Test Fixture Selection Trace math Display Display menu Tittle and text on the screen labeling graphics Display Display menu For Additional Information on See Preset values and Setting Range of each function setting value All Softkey Trees GPIB Command Reference How to control the 4291B using an external controller or the HP Instrument BASIC capability through the GPIB Appendix B in this manual Appendix C in this manual GPIB Command Reference in the Programming Manual Programming Manual 5 2 Measurement Block Wess
288. only EAL am LOSS FACTI e LOSS TNGNT fan Mast ri MORE 16 gt MAGIZI PHASE az RESISTIR REACTIA MORE 2 6 7 BHASE Y CONDUCTIG SUSE EPTIB MORE 3 6 7 REFL COEF MAG TE PHASELE I REAL Px IMAGE i MORE 4e 7 PRMEABLTY IMPEDANCE ABMHTNOE R MAGUYS CAPACITNCE PRLUCp SERICS I INDUCTNCE PRLILO SERI MORE 5 6 RESISTNCE PRURPI SE RIAs D FACTOR D l Q FACTOR Q MORE 6 6 DUAL PARAMETER FIXTURE 16454 MATERIAL SIZE DUAL PARAMETER FIXTURE 16454 MATERIAL SIZE DUAL PARAMETER FIXTURE 16454 MATERIAL SIZE DUAL PARAMETER FIXTURE 16454 MATERIAE SIZE DUAL PARAMETER FIXTURE 16454 MATERIAL SIZE DUAL PARAMETER FIXTURE 116454 MATERIAL SIZE C6005057 Dual Paramenter Menu Magnetic Material Measurement Magnetic Material Fixture Menu Magnetic Material Size Menu Figure 5 19 Permeability Measurement Menu Option 002 only m PRMEABLTY REAL Measures real part of complex permeability wr m LOSS FACTR 4 y Measures loss factor of complex permeability pr m LOSS TNGNT tan Measures loss tangent tan m MAG rl Measures absolute magnitude value of complex permeability i Measurement Block 5 23 Magnetic Materia
289. ories Introduction This chapter lists available options and accessories for the 4291B Options Available Option 001 Add dc bias This option adds the dc bias capability to the stimulus of 4291B This option can be retrofitted using 4291V Option 001 Option 002 Add material measurement firmware This option adds the material measurement capability to the 4291B This option can be retrofitted using 4291V Option 002 Option 011 Delete high impedance test head This option deletes the high impedance test head Option 012 Add low impedance test head This option adds the low impedance test head This option can be retrofitted using 4291V Option 012 Option 013 Add high temperature high impedance test head This option adds the high high temperature high impedance test head This option includes a fixture stand This option can be retrofitted using 4291V Option 013 Option 014 Add high temperature low impedance test head This option adds the high temperature low impedance test head This option includes a fixture stand This option can be retrofitted using 4291V Option 014 Options and Accessories 10 1 Options Available Option OBW Add Service Manual This option adds the 4291 B Service Manual which describes the performance test procedures and troubleshooting Option 1D5 Add high stability frequency reference This option a 10 MHz crystal in a temperature stabilized oven improves the source signal frequency
290. oving the measurement trace correspondingly Measurement Block 5 49 BOTTOM VALUE Changes the value at the bottom line of the graticule moving the measurement trace correspondingly REFERENCE X VALUE Changes the value of the center position of the X axis moving the measurement trace correspondingly This softkey is only available for the complex plane format REFERENCE Y VALUE Changes the value of the center position of the Y axis moving the measurement trace correspondingly This softkey is only available for the complex plane format SCALE FOR Selects one of the DATA and MEMORY traces to be scaled by prior functions in this menu The DATA and MEMORY traces are available using the Display menu accessed from the key All memory traces are displayed with the same scaling size D amp M SCALE E Couples or uncouples the DATA and MEMORY traces to be scaled by prior functions in this menu This is valid only for those traces obtained by the Display menu accessed from the key Sealing Parameter for Each Format Linear Format Log Format Top Value Top Value Scale Div Reference Indicator Petri Reference Value Bottom Value Bottom Value Polar Format Complex Format X axis Reference Value Position is fixed
291. ow Impedance Measurement Test Head Option 012 MO High Temperature High Impedance Test Head Option Ol8 only 2 a High Temperature Low Impedance Test Head Option Ol4 only a 3 Active Channel Block and Chan 2 ees Active Channel 2 sls n Coupling Channels Stimulus Coupling Marker Coupling 4 Entry Block Numeric Keypad 2 2 2 2 2 Terminator Keys 2 2 2 2 2 2 2 Knob 1 we e Mand onem Entry Off o a os Back Space 0 o 0 2 15 2 16 2 16 2 16 3 2 3 2 3 2 3 2 3 2 4 2 4 2 4 2 4 2 4 3 4 3 5 Measurement Block MNT M 5 8 Impedance Measurement Menu 5 9 Complex Impedance Measurement Menu 5 11 Dual Parameter Menu 2 048 5 12 Impedance Fixture Menu No option 002 5 14 Impedance Fixture Menu Option 002 only 5 15 Permittivity Measurement Menu Option 002 only 5 17 Complex Permittivity Measurement Menu Option 002 MAI 5 19 Dual Parameter Menu Dielectric Material Measurement a a a 2 2 eee 5 20 Dielectric Material Fixture Menu Option 002 only 5 21 Dielectric Material Size Menu Option 002 only 5 22 Permeability Measurement Menu Option 002 only 5 23 Complex Permeability Measurement Menu Option 002 only 2 4 4 e a 5 25 Dual Parameter Men
292. panel The following chapter 3 through 8 provides front keys and softkeys reference Each key and softkey are categorized by the key blocks on the front panel keys Chapter 3 Active Channel Block Chapter 3 describes Chan 1 or Chan 2 keys in the active channel block which is used to select channel Chapter 4 Entry Block Chapter 4 describes the Entry Block which is used to enter parameter value to the analyzer or to change setting of the analyzer Chapter 5 Measurement Block Chapter 5 describes Meas Format Display Scale Ref Cal Bw Avg keys in the measurement block which is used to corneal measurement capability of the analyzer The equivalent circuit function is also explained in this chapter Chapter 6 Stimulus Block Chapter 6 describes Sweep Source Trigger Start Stop Center and Span keys in the Stimulus Block which is used to control the stimulus source sweep functions Chapter 7 Marker Block Chapter 7 describes Marker Search Marker Utility keys in the marker block which is used to control the marker function Chapter 8 Instrument State Block Chapter 8 describes System Local Preset Copy Save and Recall keys in the Instrument State block System key section describes the capability to control channel independent system function controlling the Agilent Technologies Instrument BASIC capability adjusting internal cloc
293. ple an END message was received before the length was satisfied Invalid character A syntax element contains a character that is invalid for that type For example a header containing an ampersand SENS amp Invalid character data Either the character data element contains an invalid character or the particular element received is not valid for the header Messages 9 Temperature Coefficient Measurement Messages 10 121 7 207 Invalid character in number An invalid character for the data type being parsed was encountered For example an alpha character in a decimal numeric or a 9 in octal data INVALID DATE The date entered to set the real time clock is invalid Reenter correct date INVALID FILE NAME GPIB only The parameter file name gt for MMEMory DELete command must have a _D or S extension for LIF format or STA or DAT for DOS format INVALID MATERIAL SIZE For the permeablity measurement The material size definition is wrong The outer diameter must be larger than the inner Invalid separator The parser was expecting a separator and encountered an illegal character For example the semicolon was omitted after a program message unit RST INIT Invalid string data A string data element was expected but was invalid for some reason see IEEE 488 2 7 7 5 2 For example an END message was received before the terminal quote character Invalid suffix The s
294. quate maintenance by Buyer Buyer supplied software or interfacing unauthorized modification or misuse operation outside the environmental specifications for the product or improper site preparation or maintenance No other warranty is expressed or implied Agilent Technologies specifically disclaims the implied warranties of merchantability and fitness for a particular purpose vii Exclusive Remedies The remedies provided herein are buyer s sole and exclusive remedies Agilent Technologies shall not be liable for any direct indirect special incidental or consequential damages whether based on contract tort or any other legal theory Assistance viii Product maintenance agreements and other customer assistance agreements are available for Agilent Technologies products For any assistance contact your nearest Agilent Technologies Sales and Service Office Addresses are provided at the back of this manual How to Use This manual The Operation Manual describes all functions accessed from the front panel keys and softkeys It also provides information on options and accessories available and the analyzer features Chapter 1 Introduction Chapter 1 provides overviews of the system and main features of the analyzer Chapter 2 Front and Rear Panel Chapter 2 shows front and rear panel test station and test heads with descriptions This chapter also provides the information on I O port on the rear
295. query error that the analyzer cannot detect more specific errors This code indicates only that a query error as defined in IEEE 488 2 11 5 1 1 7 and 6 3 has occurred Query INTERRUPTED A condition causing an interrupted query error occurred see IEEE 488 2 6 3 2 3 For example a query followed by DAB or GET before a response was completely sent Query UNTERMINATED A condition causing an unterminated query error occurred see IEEE 488 2 6 3 2 2 For example the analyzer was addressed to talk and an incomplete program message was received by the controller Queue overflow A specific code entered into the queue in lieu of the code that caused the error This code indicates that there is no room in the queue and an error occurred but was not recorded RECALL ERROR INSTR STATE PRESET A serious error for example corrupted data is detected on recalling a file and this forced the analyzer to be PRESET RECEIVER GAIN OUT OF SPEC An external test 25 FRONT ISOL N fails A6 receiver IF gain is incorrect See the Service Manual for troubleshooting 241 206 221 68 330 221 228 232 Temperature Coefficient Measurement RECEIVER GAIN TEST FAILED An external test 22 RECEIVER GAIN fails See the Service Manual for troubleshooting REF OSC TEST FAILED An internal test 6 A5 REFERENCE OSC fails The reference oscillator on the A5 synthesizer does not work properly See the Service Man
296. r Option 002 Material Measurement 12 28 4291B RF Impedance Material Analyzer Technical Data Option 002 Material Measurement T w x o x pes Ww a Cc o Frequency Hz CE001214 Figure 12 21 Typical Dielectric Loss Tangent tan Measurement Accuracy thickness 3 mm i This graph shows only frequency dependence of E to simplify it The typical accuracy of tan is defined as E Ej refer to Supplemental Note 9 Characteristics for Option 002 Material Measurement 4291B RF Impedance Material Analyzer Technical Data 12 29 Option 002 Material Measurement t 0 3 mm 100M Frequency Hz Figure 12 22 Typical Permittivity Measurement Accuracy er v s Frequency thickness 0 3 mm 100M Frequency Hz Figure 12 23 Typical Permittivity Measurement Accuracy c v s Frequency thickness 1 mm 12 30 4291B RF Impedance Material Analyzer Technical Data Option 002 Material Measurement 1 00M Frequency Hz Figure 12 24 Typical Permittivity Measurement Accuracy er v s Frequency thickness 3 mm 10M 109M Frequency Hz Figure 12 25 Typical Permeability Measurement Accuracy F 0 5 4291B RF Impedance Material Analyzer Technical Data 12 31 Option 002 Material Measurement H r2100
297. r a function the softkeys are joined by vertical lines For example in the impedance measurement menu under the key the available measurement parameters are listed MAGCIZI PHASECO RESIST R REACT X with a vertical line between them Note that only one softkey can be selected at a time When a selection has been made from the listed alternatives that selection is underlined until another selection is made Softkeys That Toggle On or Off Some softkey functions can be toggled on or orr for example averaging This is indicated in the softkey label The current state on Or OFF is capitalized in the softkey label Example SWEEP AVG ON off The word on is capitalized showing that sweep averaging is currently on SWEEP AVG on OFF The word off is capitalized showing that sweep averaging is currently off Softkeys that Show Status Indications in Brackets Some softkey labels show the current status of a function in brackets These include simple toggle functions and status only indicators An example of a toggled function is the PRINT STANDARD or PRINT COLOR softkey The DATA MATH softkey is an example of a status only indicator where the selected equation of the data math function is shown in brackets in the softkey label 2 2 Front and Rear Panel Test Station and Test Heads 2 GPIB REMOTE Indicator This lights when the analyzer is in the remote state 3 Preset This key returns the instrument
298. rameters SWR values have no meaning Use SWR PHASE with I measurements MKR X AXIS E Leads the following softkeys to select X axis value to be displayed This softkey does not appear if the user trace display is turned on MKR X AXIS STIM Displays the marker stimulus value on the right upper corner of the screen When the A mode is on this softkey shows a value relative to the Amarker point O TIME Sets the x axis units to time the start point is zero and the stop point is the value of the sweep time The marker indicates the elapsed time since the sweep started This function is useful for testing a DUT s time transition characteristics at a certain fixed frequency by setting the span to zero When the A mode is ON this softkey shows a value relative to the Amarker point 1 27F Displays the relaxation time the value of 1 2afrequency instead of the marker stimulus value read out This capability is available for the frequency sweep only When the A mode is on this softkey shows a value relative to the Amarker point LEVEL MON Leads to the following softkeys which are used to monitor output level of OSC level or dc bias When this function is turned on the output level on a marker point is displayed on the top right of the screen This softkey does not appear if the user trace display is turned on OFF Turns off the level monitor function The marker displays normal marker value AC V Displays the voltage valu
299. re coefficient for OPEN residual as follows High Temperature High Impedance Test Head is used INE 0 2 8xf uS C typical High Temperature Low Impedance Test Head is used NENNEN 1 30xf uS C typical AYo2 is the hysterisis of the OPEN residual as follows a Saar uS C typical AZ is the temperature coefficient for SHORT residual as follows High Temperature High Impedance Test Head is used MEME 4 50xf mQ C typical High Temperature Low Impedance Test Head is used o 1 10 xf mQ C typical AZ is the hysterisis of the SHORT residual as follows NNNM aaa mQ C typical 12 16 4291B RF Impedance Material Analyzer Technical Data Option 013 and 014 High Temperature Test Heads 2 pm c o o o o o o 3 o o a E o ke Frequency Hz Figure 12 11 Typical Frequency Characteristics of Temperature Coefficient Using High Temperature High Impedance Test Head Zx 250 Temperature Coefficient 1 C 1 88M Frequency Hz Figure 12 12 Typical Frequency Characteristics of Temperature Coefficient Using High Temperature Low Impedance Test Head 4291B RF Impedance Material Analyzer Technical Data 12 17 Option 013 and 014 High Temperature Test Heads Operation Conditions of the Test Head The cable at least 15 cm from the test station must be in the same temparature of the main frame AN
300. res conductance value G SUSCEPT B Measures susceptance value B REFL COEF MAGCITI Measures absolute magnitude value of reflection coefficient T m PHASE OT Measures phase value of reflection coefficient 0 REAL Tx Measures real part of reflection coefficient T E IMAG Uy Measures imaginary part of reflection coefficient Ty DUAL CAPCITNCE PRL Cp Measures parallel capacitance Cp which is used for small capacitance measurement SER Cs Measures series capacitance C which is used for large capacitance measurement INDUCTNCE PRL Lp Measures parallel inductance Lp which is used for large inductance measurement SER Ls Measures series inductance L which is used for small inductance measurement m RESISTNCE PRL Rp Measures parallel resistance Rp which is used for large resistance large inductance or small capacitance m SER Rs Measures series resistance R which is used for small resistance small inductance or large capacitance m D FACTOR D Measures dissipation factor D m Q FACTOR Q Measures quality factor Q PARAMETER Leads to the Dual Parameter Menu which is used to select parameters to be measured for both channels with one key stroke m FIXTURE Leads to the Fixture Menu which is used to select the test fixture used with the analyzer The selected test fixture is displayed in brackets in the softkey label Impedance Measurement Complex
301. rial Analyzer Technical Data 12 9 Permeability Measurements amp x O x O 3 gt o i 2 T O O Frequency Hz 26600043 Figure 12 6 Typical Q Measurement Accuracy when open short 50 0 low loss capaciter calibration are done 12 10 4291B RF Impedance Material Analyzer Technical Data Option 013 and 014 High Temperature Test Heads Specification for Option 013 and 014 High Temperature Test Heads Frequency Characteristics Source Characteristics Operating frequency 1 MHz to 1 8 GHz OSC level Voltage Range 1 MHz lt Frequency lt 1 GHz Q1 GHz lt Frequency lt 1 8 GHz OSC level resolution AC voltage resolution NEN 0 2 MVims to 500 MVims elles 0 2 MVims 250 MVims 110 MVims lt Vose 500 MVemg lt ccc cece cece eee 2 mV 11 MVims lt Vose lt 110 MVpms eese 0 2 mV 1 1 MVems lt Vose lt 11 MVems 20 pV 0 2 mVems Vose lt 1 1 MVems oe eee eee ee 2 uV AC current resolution 2 75 mAmns lt lose lt 12 5 MArms 6 0 e cece eee ee 50 yA 0 275 mAgms lt lose 2 75 M rms oo eee cence ee o 5 pA O 27 5 Arms lt lose 275 M rms esse 0 5 pA 5 pA lose 27 5 pA oo ccs 0 05 yA AC power resolution 66 1 dBm lt Pos lt 1 9 dBm OSC level accuracy 1 MHz lt Frequency lt 1GHz Vose lt 0 25 Vims lose lt 6 8 mA Pose lt 4 1 dBm MENU 0 2 dBm max Stan X frequency Hz MEME A B4 1800 dB where A depends
302. rmance test 12 1 permeability measurement 5 23 11 29 permittivity measurement 5 17 11 26 phase unit 5 30 POINT AVG FACTOR 5 52 POINT AVG on OFF 5 52 port extension 5 66 9 5 11 16 power 2 10 power level 2 6 1 6 2 3 8 21 preset marker 7 5 preset state B 1 printer 10 4 printer address 8 19 printer port 2 10 print standard 8 26 Index 9 Index 10 programme menu 8 4 programming guide 12 51 Q 7 22 Q Quality Factor 11 4 Quick Start Guide 12 51 R 11 3 rack mount and handle kit option 10 2 rack mount kit option 10 2 raw data arrays 8 49 9 4 Reactance 11 3 rear panel 2 9 Recall 1 6 8 39 recall color 5 43 recall file 8 39 recharge time B 1 reference level 2 5 reference oven output 2 10 reference position 5 49 reference value 5 49 relaxation time 7 19 REMOTE indicator 2 3 Resistance 11 3 right peak 7 14 R jX 7 19 Rp 11 4 R 11 3 run cont input 2 10 sample program disk 12 51 Save 1 6 8 30 save color 5 43 SAVE COLORS 5 43 scale coupling 5 50 scale div 2 5 scale for data 5 50 scale for memory 5 50 scale per div 5 49 Scale Ref 1 5 scale reference 5 49 scaling 9 6 scan speed of 31 5 kHz 2 10 screen display 2 4 search 7 22 1 5 SEARCH LEFT SEAL 7 12 search menu 7 11 SEARCH PEAK 7 11 search range 7 15 SEARCH RANGE MENU 7 11 search range menu 7 15 SEARCH
303. rmittivity Measurement PARAMETER Menu FIXTURE Dielectric Material 16453 Fixture Menu MATERIAL Dielectric Material SIZE Size Menu Figure 5 15 Dual Parameter Menu Dielectric Material Measurement W r Measures z on channel 1 and measures e on channel 2 m tan Measures c on channel 1 and measures tan on channel 2 e tan Measures e on channel 1 and measures tan on channel 2 m tan Measures e on channel 1 and measures tan on channel 2 m SINGLE PARAMETER Leads to the Permittivity Measurement Menu FIXTURE 16453 Leads to the Dielectric Material Fixture Menu which is used to select test fixture used with the analyzer The selected test fixture is displayed in brackets in the softkey label m MATERIAL SIZE Leads to the Dielectric Material Size Menu which is used to set thickness of the dielectric material to be measured 5 20 Measurement Block Dielectric Material Measurement Dielectric Material Fixture Menu Option 002 only MEAS amp IMPEDANCE FIXTURE NONE 16453 PERMITTVTY 16453 PERMEABLTY 16454 S RETURN CE005039 Figure 5 16 Dielectric Material Fixture Menu Option 002 only This section describes the softkeys that can be accessed when Option 002 Material Measurement is installed and PERMITTVTY 16453 is selected in this menu m IMPE
304. s lt losc 44 Arms esses 0 1 pA O 4 HArms lt losc 14 pAme ees 0 04 pA AC power resolution BN j 0 1 dBm _ Map X J M dz OSC level accuracy A B4 1800 dB where A depends on temperature conditions as follows within referenced to 234 5 C 0 00 0 ene 2 dB other environmental temperature conditions 4 dB B depends on OSC level as follows Vose gt 250mWVaas 0 dB Losc gt 5 mAms Pose 2 5 dBm 250 MVims gt Vose gt 2 5 MVyomg isse 1 dB 5 mArms gt Losc gt 50 ptArms 5 dBm gt Pos gt 45 dBm other OSC level 000 e 2 dB Definition of OSC level m Voltage level 2 x voltage level across the 50 Q which is connected to the output terminal this level is approximately equal to the level when a terminal is open m Current level 2 x current level through the 50 Q which is connected to the output terminal this level is approximately equal to the level when a terminal is shorted m Powerlevel when terminating with 50 Q OSC level accuracy Connector Output impedance DC bias Option 001 DC voltage level DC current level 12 2 4291B RF Impedance Material Analyzer Technical Data 1 2 of specification value typical APC7T 50 Q Nominal value 0 to 40V Permeability Measurements DC level resolution sssses ImV 204A DC level accuracy 23 5 C Voltage
305. s contain the expanded calibration coefficients obtained by calibration and fixture compensation c Raw data arrays contain the calibrated data obtained using the calibration coefficients O Data arrays contain the compensated data obtained using the compensation coefficients o Memory arrays contain the memory data arrays obtained using the DATA MEM operation O Data Trace arrays contain the formatted data c Memory Trace arrays contain the formatted data of the memory arrays These arrays can be saved selectively to suit the application For example when measuring several devices with the same measurement settings you may need to save only the trace arrays for each device Saving only the necessary arrays reduces the disk space required and the disk access time In addition saving internal data also allows the analysis of the measurement results using an external controller See File Structure of Internal Data Arrays File for Binary Files for more information Graphics Images GRAPHICS m Graphics consist of the graphic images on the screen created using TIFF Tagged Image File Format File Type and Data Group Combinations You can select and save to a disk one of the following four combinations of the two file types and the four data groups m Dinary File o Instrument states and internal data arrays STATE o Internal data arrays DATA ONLY binary o Graphics image GRAPHICS m ASCII File a Int
306. s in contact with any hard surface Never store connectors with the contact end exposed End caps are provided with all Agilent Technologies connectors and these should be retained after unpacking and placed over the ends of the connectors whenever they are not in use Above all never store any devices loose in a box or in a desk or a bench drawer Careless handling of this kind is the most common cause of connector damage during storage Calibration devices and test fixtures should be stored in a foam lined storage case and protective end caps should always be placed over the ends of all connectors Cables should be stored in the same shape as they have when they are used they should not be straightened and end caps should be placed over both connectors The following figure summarizes these Agilent Technologies recommendations on handling and storing devices that have microwave connectors Handle and Store Connectors Carefully Never Place Connectors Contact End Down Use End Caps m Extend threads fully when end caps are not used m Use foam lined storage cases if available m Never store devices loose in a box or in a desk or bench drawer Front and Rear Panel Test Station and Test Heads 2 17 Active Channel Block The analyzer has two active channels Figure 3 1 that provide independent displ
307. sation coefficient arrays or the user defined point fixture compensation coefficient arrays When the current measurement point is different from the compensation measurement point the coefficient value is interpolated from the fixed point fixture compensation coefficient arrays or user defined point fixture compensation coefficient arrays Fixture Compensation When a fixture compensation measurement has been performed and this function is turn on fixture compensation removes the errors caused by the test fixture See Fixture Compensation in Chapter 11 for details Data Arrays The results of error correction are stored in the data arrays as complex number pairs These arrays are accessible via GPIB or by using the floppy disk drive or the memory disk Memory Arrays If the data to memory operation is performed the data arrays are copied into the memory arrays data trace arrays are also copied into the memory trace array at same time See Display in Chapter 5 in this chapter These arrays are accessible using the floppy disk drive or the memory disk These arrays are also output via GPIB but data cannot be input into this array via GPIB Analyzer Features 9 5 Data Processing 9 6 Analyzer Features If memory is displayed the data from the memory arrays goes through the same data processing flow path as the data from the data arrays Format This converts the complex number pairs into a scalar representation for d
308. sing High Temperature Low Impedance Test Head High OSC Level 4291B RF Impedance Material Analyzer Technical Data 12 15 Option 013 and 014 High Temperature Test Heads Typical Effects of Temperature Drift on Measurement Accuracy When environment temperature is without 5 of temperature at which calibration is done add the following measurement error Conditions of Typical Effects of Temperature Drift m Environment temperature of a test head is within 55 C to 0 C or 40 C to 200 C m Environment temperature of the mainframe is within 5 C of temperature at which calibration is done and within 0 C to 40 C m Other conditions are as same as the conditions of the basic measurement accuracy of option 013 014 Z Accuracy naer Eaz Eye Ea E Y ACCUYACY ooann aaaea RD rad where Eaz AA AT AA x 109 Epa Zoo Lx Yo2Z x 100 AA is the effect of temperature drift on the impedance measurement value as follows NENNEN 50 300xf ppm C typical AA is the hysterisiss of the effect of temperature drift on the impedance measurement value as follows AA AT MEME 3 ppm typical f Measurement Frequency GHz AT Difference of temperature between measurement condition and calibration measurement condition C Yoo AY AT AY x10 S Zs2 AZ AT AZ 2 x10 Q Zx Impedance measurement value Q AY is the temperatu
309. sk as the storage device DISK shows the floppy disk is selected and TMEMORY shows the memory disk is selected This setting does not change even when the line power is cycled or the key is pressed FILE UTILITIES PURGE FILE PURGE YES rt file name NO file name Figure 8 23 Purge Yes No Menu m PURGE YES Removes the file and returns to the previous menu NO Returns to the previous menu without purging the file Instrument State Block 8 37 Initialize Yes No Menu Save Y FILE UTILITIES M INITIALIZE INITIALIZE DISK YES NO Figure 8 24 Initialize Yes No Menu m INITIALIZE DISK YES Initializes the disk or the memory disk When the floppy disk is selected for initialization DISK is displayed in the softkey label When the memory disk is selected MEMORY is displayed m NO Returns to the previous menu without initializing the floppy disk or the memory disk 8 38 Instrument State Block Recall Recall Menu file name A file name file name file name PREV FILES NEXT FILES STOR DEV DISKI 4 Figure 8 25 Recall Menu m file name Selects a file to be loaded and loads the instrument state or data m PREV FILES Displays the previous set of file names used to load data m NEXT FILES Displays the next set of file names used to load data m STOR DEV Selects between the flopp
310. st sweep table and limit test table Saving the instrument state and or data to the built in disk or memory disk Recalling the instrument state and or data from the built in disk or memory disk Instrument State Block 8 1 8 2 Functions accessed from this block You can access from See the following section in this chapter Beep on off Cal kit definition table Clock Delete file HP Instrument BASIC GPIB address Initialize disk Limit test table Limit testing Limit line List measurement value List sweep table Memory size for memory disk OPEN SHORT LOAD definitions for fixture compensation Operating parameter list Preset instrument Print display Hsien Copy rsen Gave sien Local Gave Copy ien Copy Cops ien Copy Cony Preset Copy Recall state data from the floppy disk and memory Recall disk Save state data to the floppy disk and memory disk Save System controller Addressable Loca Beep menu Copy menu Clock menu Save menu Instrument BASIC menu Local menu Save menu Copy menu Limit Test menu Copy menu Copy menu Memory partition menu Copy menu Copy menu Copy menu Recall menu Save menu Local menu For Additional Information on See All Softkey Trees GPIB Command Reference Preset values and Setting Range of each function setting value How to control the 4291B using an external
311. t m INDUCTNCE PRL Lp Measures parallel inductance Lp which is used for large inductance measurement m SER Ls Measures series inductance L which is used for small inductance measurement a RESISTNCE PRL Rp Measures parallel resistance Rp which is used for large resistance large inductance or small capacitance 3 SER Rs Measures series resistance Rs which is used for small resistance small inductance or large capacitance O D FACTOR D Measures dissipation factor D Jg FACTOR Q Measures quality factor Q PARAMETER Leads to the Dual Parameter menu which are used to select parameters to be measured for both channels with one key stroke m FIXTURE 16453 Leads to the Fixture Menu which is used to select the test fixture used with the analyzer 16453 is displayed in brackets in the softkey label when the permittivity measurement menu is accessed MATERIAL SIZE Leads to the Material Size Menu which is used to set the thickness of the dielectric material to be measured 5 18 Measurement Block Dielectric Material Measurement Complex Permittivity Measurement Menu Option 002 only IMPEDANCE Z ADMITTANCE CY REFL COEF Cr PERMITTIVTY te DUAL PARAMETER FIXTURE Dielectric Material 16453 Fixture Menu MATERIAL Dielectric Material SIZE Size Menu CE005054 Figure 5 14 Complex Permi
312. t circuit function uses this memory trace in order to display the result of simulating the frequency characteristics bigis DATA MATH Leads to the Data Math Menu The data math function selected is shown in brackets DATA MEM shows that the data math function selected DATA MEM EQUIV CKT MENU Leads to the Equivalent Circuit menu which is used to derive values of equivalent circuit parameters and simulate frequency characteristics of equivalent circuits TITLE Displays the title menu in the softkey labels and the character set in the active entry area to display the title in the active channel title area on the screen LABEL MENU Leads to the Label menu which is used to label text on any area of the screen TRACE Turns the user trace display on or off When the user traces are turned on the normal data memory trace is not displayed USER shows the user trace is displayed DATA amp MEM shows the normal data trace is displayed GRATICULE ON off Turns the graticule of the active channel on or off If the graticule is not erased when GRATICULE ON off is turned off When Dual channel is on Split display is off and both channels are using the same format the graticule is not erased even if the graticule setting of either channel is tuned off In this case turn the GRATICULE ON off of both channels to off When a user trace is displayed the graticule cannot be erased using GRATICULE ON off
313. t measurement results directly to a compatible printer or plotter This section provides an overview of GPIB operation The Quick Start Guide provides information on how to use the analyzer to control peripherals It also explains how to use the analyzer as a controller to print and plot More complete information on programming the analyzer remotely over GPIB is provided in Programming Manual The Programming Manual includes examples of remote measurements using an HP Vectra PC with BASIC programming The Programming Manual assumes familiarity with front panel operation of the instrument For more information on the IEEE 488 1 and 488 2 standard see IEEE Standard Digital Interface for Programmable Instrumentation published by the Institute of Electrical and Electronics Engineers Inc 345 East 47th Street New York 10017 USA The GPIB uses a party line bus structure in which up to 15 devices can be connected on one contiguous bus The interface consists of 16 signal lines and 6 grounded lines in a shielded cable With this cabling system many different types of devices including instruments computers plotters and printers can be connected in parallel Every GPIB device must be capable of performing one or more of the following interface functions Talker A talker is a device capable of sending device dependent data when addressed to talk There can be only one active talker at any given time Examples of this type of device are v
314. t parameters and shows simulation result on the screen using memory trace NO 1 In other words simulation results are stored into the NO 1 memory trace m DISP EQV PARM ON Toggles the display of the equivalent circuit parameter value Table 5 1 Equivalent Circuit Selection Guide Equivalent Circuit Type of devices Typical Frequency Characteristics H1 9 A C1 inductors with high LZ i core loss L1 AAAS m C1 9 B o 4 4 o inductors and resisters pon IZ L1 R1 co LZ C 00 high value resistors 9 L1 R1 m Z D prey o capacitors 9 L1 C1 R1 co 0 E o i o resonators pon Li ci Ri La The equivalent circuit function is available only for the frequency sweep The equivalent circuit function is not available for OSC level and de bias sweep You should set the resonant frequency in the sweep range to get the right result Analysis Range can be specified The frequency range used to calculate parameters can be specified using the menu accessed from the SEARCH RANGE MENU under the key Measurement Block 5 41 Adjust Display Menu INTENSITY INTENSITY BACKGROUND MODIFY MORE COLORS s AD JUST CHI DATA DISPLAY CHUMEM LIMIT EN CHO DATA Color Adjust MENU CH3 MEM LIMIT LN GRATICULE WARNING MORES
315. t the 4291A can recall Following settings are not saved Printing resolution dpi Sheet orientation Form feed Top margin Left margin Softkey label printing m RE SAVE FILE Displays the Re save File menu used to update a file that is already saved m BACK UP MEMO DISK Backup the instrument state and the internal data arrays in the memory disk m FILE UTILITIES Displays the following softkeys PURGE FILE Displays the Purge File menu used to remove a file saved on the disk CREATE DIRECTORY Specifies creating a new directory in a DOS format disk This function is not available for LIF files CHANGE DIRECTORY Specifies changing the current directory of a DOS format disk This function is not available for LIF files COPY FILE Copies files When a file is copied between the floppy disk and the memory disk the disk formats of the disk and the memory disk must be same format Use the same disk format type for COPY FILE When you copy files using this function use the same disk format type for both the memory disk and the floppy disk This copy function cannot copy files when the format of the memory disk is different from the format of the floppy disk INITIALIZE Displays the Initialize menu A new disk must be initialized before data is stored on it The disk can be formatted in either LIF or DOS format FORMAT LIF Toggles the disk format between the LIF and DOS formats that are used when initializing a new disk
316. ta rate depends on the transfer rate of the slowest device involved m Address Capability Primary addresses 31 talk 31 listen A maximum of 1 active talker and 14 active listeners at one time Multiple Controller Capability In systems with more than one controller only one can be active at any given time The active controller can pass control to another controller but only one system controller is allowed Analyzer GPIB Capabilities As defined by the IEEE 488 1 standard the analyzer has the following capabilities SH1 AHi T6 TEO L4 LEO SRI RL1 PPO DC1 DT1 C1 C2 C3 C4 C11 E2 Full source handshake Full acceptor handshake Basic talker answers serial poll unadresses if MLA is issued No talk only mode Does not have extended address of talker Basic listener unadresses if MTA is issued No listen only mode Does not have extended address of listener Complete service request SRQ capabilities Complete remote local capability including local lockout Does not respond to parallel poll Complete device clear Responds to a group execute trigger System controller capabilities in system controller mode Pass control capabilities in addressable mode Tri state drivers Instrument State Block 8 45 GPIB Function 8 46 Bus Mode The analyzer uses a single bus architecture The single bus allows both the analyzer and the host controller to have complete access to the peripherals in the s
317. talled and the 16453A is selected as the fixture to be used m COMPEN MENU Leads to the following softkeys which are used to perform a fixture compensation measurement D OPEN Measures OPEN for the fixture compensation SHORT Measures SHORT for the fixture compensation LOAD Measures the standard device furnished with the 16453A for the fixture compensation COMP POINT Toggles between FIXED and USER DEFINED to select the fixture compensation measurement points When FIXED is displayed the analyzer performs fixture compensation measurements on points fixed across the full sweep range and the effective value for the points between these measured points will be caleulated using the interpolation method When USER is displayed the analyzer performs fixture compensation measurements on the same points as the current stimulus setting Cl DONE COMPEN Completes the fixture compensation and then computes and stores the error coefficients m RESUME COMP SEQ Eliminates the need to restart a fixture compensation sequence that was interrupted to access some other menu Goes back to the point where the fixture compensation sequence was interrupted 5 58 Measurement Block Fixture Compensation Menu for Permeability Measurement Cal COMPEN MEN FIXTURE 4 COMPEN SHORT COMP POINT FIXED DONE COMPEN RESUME COMP SEQ RETURN Figure 5 45 Fixture Compensation Menu for
318. tes the command you entered CANCEL Cancels command and returns to the previous menu CLEAR 1 0 Enters the CLEAR I O command in the BASIC command line The CLEAR I O command causes the execution of an I O related command to pause Press Continue to resume the execution RESET Enters the RESET command in the BASIC command line The RESET command terminates program execution without confirmation System Program Menu PROGRAM 5 file name MENU PREV FILES NEXT FILES STOR DEV DISK CE008005 Figure 8 5 Peogram Menu m file name Shows IBASIC program file names in the floppy disk or memotry disk m PREV FILES Shows previous program file list mE NEXT FILES Shows next program file list STOR DEV Select a strage system to floppy disk or memory disk DISK means the floppy disk drive and MEMORY means the memory disk Instrument State Block 8 9 Memory Partition Menu System 64K RAM 448K BASIC 128K RAM 384K BASIC 256K RAM MEMORY PARTITION gt 256K BASIC 384K RAM 128K BASIC 448K RAM 64K BASIC DON y CHANGE YES NO Peancei CE008021 Figure 8 6 Memory Partition Menu m mmK RAM nnK BASIC Selects the memory partitions so that mm Kbytes are used for memory disk and nn Kbytes are used for array of HP Instrument BASIC In fact the
319. that is out of limits If the limit lines are on and other listed data allows sufficient space the following information is also displayed m Upper limit and lower limit m The margin by which the device passes or fails the nearest limit 8 42 Instrument State Block Limit Line Concept For more information about the list values feature see Copy Menu Results of Printing the Display with Limit Lines ON If limit lines are on they are shown when you print the display If limit testing is oN the PASS or FAIL message is included as well Note An example of a measurement using limit lines and limit testing is i Y Y provided in the Quick Start Guide A sample program performing a limit test using GPIB commands is provided in the Programming Manual Instrument State Block 8 43 GPIB Function GPIB 8 44 What is GPIB How GPIB Works Instrument State Block The analyzer is factory equipped with a remote programming digital interface using the GPIB This allows the analyzer to be controlled by an external computer that sends commands or instructions to and receives data from the analyzer using the GPIB In this way a remote operator has the same control of the instrument available to a local operator from the front panel except for the line power switch In addition the analyzer itself can use GPIB to directly control compatible peripherals without the use of an external controller It can outpu
320. the Display with Limit Lines ON 8 43 BEBA 8 44 What is GPIB 2 2 8 44 How GPIB Works aoaaa a 4 sn 8 44 Talker oa ees 8 44 Listener oaoa a 8 44 Controller oaa a a a 8 45 GPIB Requirements 2 048 8 45 Analyzer GPIB Capabilities 8 45 Bus Mode 2 2 2 2 2 52 2 5 2 8 46 System Controller 8 46 Addressable 2 2 8 46 Setting Addresses a a a a ll nn 8 47 Saving and Recalling Instrument States and Data 8 48 Storage Devices 2 2 2 2 2 2 8 48 Disk Requirements 2 8 48 Disk Formats 4r 8 48 Memory disk Capacity 8 48 Copy Files Between the memory disk and the floppy Disk 2 2 2 2 2 2 2 2 8 48 File Types and Data Groups 8 48 File Types 2 2 25 2 2 2 5 8 48 Data Groups 2 25 2 2 2 5 5 8 49 Graphics Images GRAPHICS 8 49 File Type and Data Group Combinations 8 49 File Names ll llle n 8 50 Valid Characters for File Names 8 50 Suffixes LIF and Extensions DOS 8 50 Auto Recall Function l l rn 8 50 Contents 5 Contents 6 File Structure of Internal Data Arrays File for Binary Files 2 2 4 File Header M Data Group e File Structure of Internal Data Arrays File for ASCI
321. the adjacent measurement points on both sides That is the search functions search for a peak where the gradient is greater than AY AX and the amplitude is greater than the threshold value The search functions ignore a peak when the amplitude value is less than the threshold even if the peak polarity is set to negative C6007016 7 26 Marker Block Figure 7 15 Peak Definition Instrument State Block The instrument state block keys and associated menus control channel independent system functions These include controller modes analyzer addresses real time clock limit lines and limit testing HP Instrument BASIC beeper or printing saving instrument states and data on a built in disk or memory disk and the preset state INSTRUMENT STATE Emm O Rmt one Pees Preset j csev Save pese 050058001 Figure 8 1 Instrument State Block Controlling HP Instrument BASIC Adjusting the internal real time clock that is used to print the current time and date on the head of a hard copy Toggling Beeper ON OFF Making Limit Lines and executing Limit Testing Service Menu used for testing See the Service Manual for more information The Service Manual is furnished with Option OBW Setting GPIB mode and addresses Presetting State Copy Printing screen image listing measurement data and operating parameters calibration kit parameters li
322. to Recall Function When the analyzer is turned on it looks for a file named AUTOREC from the floppy disk If the file is found the analyzer automatically uses the file to retrieve its data When both state and data files have been saved the analyzer recalls only the state file 8 50 Instrument State Block Saving and Recalling File Structure of Internal Data Arrays File for Binary Files FILE TOP terna When internal data arrays are saved as a binary file the arrays file consists of a file header at the top of the file and the data groups following the file header File Header Every internal data array file begins with a file header The following figure shows the header structure ON 1 Use Only 6 bytes Data Switches 7 bytes OFF 0 Internal Use Only 4 bytes NN eS RAW CAL DATA MEMORY USER DATA COEFF DATA MEMORY TRACE TRACE TRACE Figure 8 28 File Header Structure Seven data switches define the data group that follows the file head Each one byte switch is either 1 or 0 decimal value if the applicable data group exists or not respectively The data group to be followed is in the same order of these switches For example when the data switches RAW DATA and DATA TRACE are 1 on while the others are oFF only the RAW DATA and DATA TRACE in this order groups will follow the header Instrument State Block 8 51 Saving an
323. trace display screen m HEADLINE Displays the Letter menu to enter characters for a headline at the top left corner of the user trace display screen The headline can be defined for each user trace individually FOOTNOTE Displays the Letter menu to enter characters as a footnote at the bottom of the user trace display screen The footnote can be defined for each user trace individually m X UNIT LABEL Displays the Letter menu to enter the x axis unit label of a current selected user trace m Y UNIT LABEL Displays the Letter menu to enter the y axis unit label of a current selected user trace TRACE Turns the user trace display on or off When the user traces are turned on the normal data memory trace is not displayed USER shows the user trace is displayed DATA amp MEM shows the normal data trace is displayed ADJUST DISPLAY Provides a menu for adjusting display intensity colors and accessing save and recall functions for modified display color sets Scale Ref Scale Reference Menu Scale Ref AUTO SCALE Scale Ref SCALE DIV REFERENCE POSITION REFERENCE VALUE MARKER gt REFERENCE TOP VALUE BOTTOM VALUE MORE SCALE FOR DATA D amp M SCALE COUPLE REFERENCE X VALUE REFERENCE Y VALUE RETURN CE005024 Figure 5 38 Scale Reference Menu AUTO
324. ttance on the polar or complex plane format This softkey is not available when Smith or admittance chart is selected m REFL COEF T Measures complex impedance on Smith admittance polar or complex plane format m PERMEABILITY ju Measures complex relative permeability on the polar or complex plane format This softkey is not available when Smith or admittance chart is selected m DUAL PARAMETER This softkey is not available for Smith admittance polar chart and complex plane formats m FIXTURE Leads to the Fixture Menu which is used to select the test fixture used with the analyzer The selected test fixture is displayed in brackets in the softkey label wm MATERIAL SIZE Leads to the Material Size Menu which is used to set the diameters of the magnetic material to be measured Measurement Block 5 25 Magnetic Material Measurement Dual Parameter Menu Magnetic Material Measurement Meas PESE Parameter rans petani puritan amp i i SINGLE Permeability Measurement Menu PARAMETER FIXTURE Magnetic Material 16454 8 Fixture Menu MATERIAL gt Magnetic Material SIZE Size Menu Figure 5 21 Dual Parameter Menu Magnetic Material Measurement E p y Measures j on channel 1 and measures p on channel 2 E j tan Measures yp on channel 1 and measures tan on channel 2 m y tan Measures u on channel 1 and measures tan on channel 2
325. ttivity Measurement Menu Option 002 only This softkey menu can be accessed at the following conditions m Format the polar Smith admittance or complex plane format is selected m Fixture 16453A is selected m IMPEDANCE Z Measures complex impedance on the polar or complex plane format This softkey is not available when Smith or admittance chart is selected m ADMITTANCE Y Measures complex admittance on the polar or complex plane format This softkey is not available when Smith or admittance chart is selected m REFL COEF T Measures complex impedance on Smith admittance polar or complex plane format m PERMITTVTY Measures complex relative permittivity on the polar or complex plane format This softkey is not available when Smith or admittance chart is selected m DUAL PARAMETER This softkey is not available for Smith admittance polar chart and complex plane formats m FIXTURE Leads to the Fixture Menu which is used to select the test fixture used with the analyzer The selected test fixture is displayed in brackets in the softkey label m MATERIAL SIZE Leads to the Material Size Menu which is used to set thickness of the dielectric material to be measured Measurement Block 5 19 Dielectric Material Measurement Dual Parameter Menu Dielectric Material Measurement M a Dual Parameter er dano amp r tan 6 amp r tan 5 PRMITIVTY amp r r SINGLE Pe
326. u m PRINT STANDARD Copies one page of the tabular listings to a compatible HP graphics printer Either STANDARD for a black and white printer or COLOR for a color printer is shown in brackets 1 This identifies which printer is selected as the default in the print setup menu The default setting at power on is standard Default text for a color printer is black m COPY ABORT Aborts a print in progress COPY TIME ON off Turns printing time and date on or oFF time and date are printed first then the information displayed See Clock Menu for setting the internal clock m NEXT PAGE Displays the next page of information in a tabular listing m PREV PAGE Displays the previous page of information in a tabular listing m RESTORE DISPLAY Turns off the tabular listing and returns the measurement display to the screen Instrument State Block 8 29 Save STATE DATA ON y SAVE BINARY SAVE ASCII DEFINE SAVE DAT STOR DEV DISK RETURN gt on OFF RAW 4 on OFF CAL on OFF DATA on OFF MEM on OFF DATA TRACE on OFF MEM TRACE GRAHICS 4291A STATE USER TRACE on OFF RETURN Define Save Data Menu file name RE SAVE FIEE BACK UP MEMO DISK FILE UTILITIES E PURGE file name file name fil name PREM FILES NEXT FILES STOR DEV IDISK FI
327. u Magnetic Material Measurement 5 26 Magnetic Material Fixture Menu Option 002 only 5 27 Magnetic Material Size Menu Option 002 only 5 29 Format 5 30 Format Menu or s 5 30 User Trace Format Menu 5 81 MENU 5 32 Display Menu 2 2 2 2 2 2 5 33 Display Allocation Menu 5 36 Data Math Menu 5 38 Equivalent Circuit Menu 5 40 Adjust Display Menu 5 42 Color Adjust Menu 5 44 Label Menu 2 2 2 2 2 2 5 2 5 45 Title menu a ll en 5 46 User Trace Display Menu 5 47 ML 5 49 Scale Reference Menu ll sn 5 49 User Trace Scale Menu s 5 51 ML 5 52 Averaging Menu 2 2 2 2 2 2 2 5 5 52 MM 5 54 Calibration Menu l l rss 5 55 Fixture Compensation Menu for Impedance Measurement a a a llle 5 57 Fixture Compensation Menu for Permittivity Measurement a a a llle 5 58 Fixture Compensation Menu for Permeability Measurement a a a llle 5 59 Calkit Menu 2 2 2 25 2 2 5 2 2 2 5 60 CAL KIT we ee s 5 60 Compen Kit Menu for Impedance Measurement Fixture 2 2 2 2 2 2 2 2 5 4 5 62 Compen Kit Menu for Permittivity Measurement Fixture aoaaa 5 64 Port Extension Menu 048 4 5 66 Contents 3 6 Stimulus Block Sweep ees woe ee ee ej 6
328. ual for troubleshooting RTC CHIP TEST FAILED An internal test 1 A1 CPU fails The A1 CPU s RTC Real Time Clock does not work properly Replace the A1 CPU with a new one See the Service Manual for troubleshooting SAMPLE FREQUENCY OUT OF SPEC An internal test 14 A6 SEQUENCER fails The sampling frequency of the sample hold circuit on the A6 receiver IF is out of its limits SAVE ERROR A serious error for example physically damaged disk surface is detected on saving a file SEGMENT START STOP OVERLAPPED Segments are not allowed to be overlapped Reenter appropriate value for start or stop value of segments to avoid that segment is not overlapped Self test failed A self test failed Contact your nearest Agilent Technologies office or see the Service Manual for troubleshooting Settings conflict A legal program data element was parsed but could not be executed due to the current device state see IEEE 488 2 6 4 5 3 and 11 5 1 1 5 SOURCE LEVEL TEST FAILED An internal test 15 SOURCE LEVEL fails See the Service Manual for troubleshooting SOURCE LEVEL TEST FAILED An external test 20 SOURCE LEVEL fails See the Service Manual for troubleshooting Messages 17 Temperature Coefficient Measurement Messages 18 226 221 SOURCE OSC TEST FAILED An internal test 13 A8A1 SOURCE OSC fails The source oscillator on the A3A1 ALC does not work properly See the Service Manu
329. uffix does not follow the syntax described in IEEE 488 2 7 7 3 2 or the suffix is inappropriate for the analyzer INVALID X AXIS VALUE FOR LOG User trace cannot be displayed in log scale because m The right value and left value of the X axis is same m The X axis range is defined from value to value Change the X axis right left value KEY CHIP TEST FAILED An internal test 1 Al CPU fails The Al CPU s front keyboard control chip does not work properly Replace the A1 CPU with a new one See the Service Manual for troubleshooting LIF DOS COPY NOT ALLOWED If you try to copy a file between the memory disk and the floppy disk when the format of the memory disk is different from the format of the floppy disk this message is displayed 238 238 250 78 245 33 32 Temperature Coefficient Measurement LIST TABLE EMPTY OR INSUFFICIENT TABLE The frequency list is empty To implement the list frequency mode add segments to the list table LO Z HEAD TEST FAILED An external test 31 LOW Z HEAD fails See the Service Manual for troubleshooting LOW Z HEAD TEST FAILED An external test 31 LOW Z HEAD fails See the Service Manual for troubleshooting Mass storage error A mass storage error occurred This error message is used when the analyzer cannot detect the more specific errors described for errors 251 through 259 MATERIAL SIZE UNDEFINED For the permittivity and perme
330. uit 11 54 Then the compensation coefficients are Acompen 1 j0 11 55 Zsm 1 YomZsm Zss Zsm YosZss 7 1 YomZsm YosZss 11 56 Beompen Yom 1 YomZsm Yos Yom YosZss 1 YomZsm YosZss 11 57 Ccompen Impedance Measurement Basics 11 23 Fixture Compensation 11 24 Impedance Measurement Basics OPEN LOAD Compensation When OPEN and LOAD compensations are used for the fixture compensation one additional condition is required to solve the Z equation The condition assumes that SHORT measurement capability is ideal that is the measurement value for perfect SHORT standard equals to perfect SHORT value This condition is explained as follows Assuming that B 0 11 58 Then the compensation coefficients are Yim Yom compen Ap yY 11 A P Yis Yos 59 Beompen 0 jo 11 60 Yom Yis Yim Yos compen 7 11 61 C P Yis Yos 6 SHORT LOAD Compensation When SHORT and LOAD compensations are used for the fixture compensation one additional condition is required to solve the Zx equation The condition assumes that SHORT measurement capability is ideal that is the measurement value for perfect OPEN standard equals to perfect OPEN value This condition is explained as follows Assuming that C 0 11 62 Then the compensation coefficients are Los Zis compen 5 TH 7 11 A P Zsm Zim 63 Zim Zss Zsm is Beom en 11 64 P Los Zis 6 Ceompen 0 jo 11
331. ure section is virtually an extension of the test port The inherent effect in the coaxial coupling terminal is represented by the electrical length value particular to the test fixture On the other hand the contact section that is the electrodes on the fixtures has different characteristics from the 500 distributed constant test port Elimination of Electrical Length Effects in Test Fixture The 4291B has a typical electrical length for the specified test fixtures When a test fixture is selected the 4291B automatically sets the typical electrical length value for the fixture selected The technique to eliminate the electrical length uses the same technique as the port extension function See Port Extension for more information on port extension Residual and Stray Parameters of Contact Electrode Section The contact electrode terminal section can not be regarded as part of the distributed constant circuit Because a correction calculation performed on the basis of the test fixture selection provided by the 4291B does not compensate for the residual and stray parameters in the contact section these residuals and strays contribute to measurement errors The residual and stray factors in the test fixtures is illustrated in Figure 11 14 11 20 Impedance Measurement Basics Fixture Compensation Elimination of Residual Parameter Effects in Test Fixture Fixture Compensation In general these residual and stray factors can be
332. value SAVE USER FXTR Saves the extension value and label of a user defined fixture o MODIFY Leads to the following softkeys which are used to define the electrical length and label of a user s fixture m DEFINE EXTENSION Makes the extension value of the user defined fixture the active function to define its value m LABEL FIXTURE Makes the fixture label name the active function to define it m KIT DONE MODIFIED Completes the procedure to define the user fixture and save it What is fixture setting Fixture menu sets the electrical length in order to cancel errors caused by an additional impedance in a distributed element of a coaxial coupling terminal between the APC 7 connector and the contact electrode of a fixture And this setting doesn t influence calibration For more information on fixture characteristics see Fixture Compensation in Chapter 11 About the relation between fixture setting and calibration see Figure 9 2 User fixture definition is backed up by battery The analyzer keeps the definition of a user fixture in the battery backup memory to ensure that the definition is retained even if the analyzer is turned off It is not necessary to set test fixture in this menu when 5 16 Measurement Block When you perform all three fixture compensation measurements OPEN SHORT and LOAD it is not necessary to specify the test fixture in this menu Because OPEN SHOR
333. ware failure Do not input external DC BIAS If this message keeps on being displayed contact your nearest Agilent Technologies service office DC BIAS TEST FAILED An internal test 16 DC BIAS fails See the Service Manual for troubleshooting DIN CHIP TEST FAILED An internal test 1 Al CPU fails The Al CPU s DIN control chip does not work properly Replace the Al CPU with a new one See the Service Manual for troubleshooting Messages 5 Temperature Coefficient Measurement Messages 6 204 203 200 205 DSP CHIP TEST FAILED An internal test 1 Al CPU fails The Al CPU s DSP Digital Signal Processor does not work properly Replace the A1 CPU with a new one See the Service Manual for troubleshooting DSP SRAM R W ERROR An internal test 2 Al VOLATILE MEMORY fails The DSP s SRAM on the Al CPU does not work properly Replace the Al CPU witha new one See the Service Manual for troubleshooting DUAL PORT SRAM R W ERROR An internal test 2 Al VOLATILE MEMORY fails The DSP s dual port SRAM on the Al CPU does not work properly Replace the Al CPU with a new one See the Service Manual for troubleshooting DUPLICATE FILE EXTENSION The extension name GRAPHICs or ASCII DATA 1 MMEMory FNAMe EXTension 1 2 is already used for other file types Use other extension name EEPROM CHECK SUM ERROR An internal test 1 Al CPU fails The data Correction Constants
334. wed m System executing command entered from keyboard CANNOT enter commands 12 Stimulus Span Stop Value 13 CW Frequency Displays the stop frequency of the sweep range in frequency domain measurements or the upper limit of a OSC level or dc bias sweep When the stimulus is in center span mode the span is shown in this space The stimulus values can be blanked see Display in Chapter 5 Displays the measurement frequency when the OSC level or dc bias sweep is selected When the frequency sweep is selected this area is blank 14 Stimulus Center Start Value 15 OSC Level Displays either the start frequency of the sweep range for frequency domain measurements or the lower power value in OSC level or dc bias sweep When the stimulus is in center span mode the center stimulus value is shown in this space Displays the OSC level of the test signal output when the stimulus is frequency or dc bias When the OSC level is selected as stimulus this area is blank 2 6 Front and Rear Panel Test Station and Test Heads 16 Status Notations Displays the current status of various functions for the active channel The following notations are used vi Il COR cO Cor C Cc C C CMP Cmp Cm Cm Del Avg D M D M D M D M 0 G amp 0 Hld ext man bus Svc Stimulus parameters changed measured data in doubt until a complete fresh sweep has been taken DC bias output is clamped to t
335. ws the marker stimulus values to be controlled independently on each channel 7 4 Marker Block Marker m MKR DISCRETE MKR CONT Toggles between the continuous and discontinuous marker mode MKR DISCRETE Places markers only on the measured trace points as determined by the stimulus settings MKR CONT Interpolates between the measured points to allow the markers to be placed at any point on the trace Displayed marker values are also interpolated This is the default marker mode m AMODE MENU Displays the Delia Mode menu that is used to define the difference in values between the marker and a Amarker Marker Block 7 5 Delta mode menu 7 6 Marker Block Marker MODE MENU AMKR FIXED OMKR TRACKING MODE OFF MKR STIMULUS FIXED MKR VALUE FIXED MKR AUX VALUE RETURN CE007004 Figure 7 4 Delta Mode Menu AMKR Puts the delta marker on the current position of the marker FIXED AMKR Sets a user specified fixed reference marker The stimulus and amplitude values can be set arbitrarily and can be anywhere in the display area Unlike other markers the fixed Amarker need not be on the trace The fixed Amarker is indicated by a small triangle A and the marker stimulus and measurement values are shown relative to this point The notation AMkr is displayed at the top right corner of the graticule TRAC
336. xf087 8 lt Nav 5 _7 0 02 V lt Vose lt 0 12 0 1 0 001 x frye 2x1075 2x 10 7 x fra 0 12 V Vose 0 1 0 001 x frm 1x10 2x10 xfimHz 1 Vosc 0 12 V lose 3 mA Pose 210 dBm Vosc 20 02 V Iosc 0 5 mA Pose 26 dBm Table 12 4 Z and Y when Low Impedance Test Head is used Measurement Conditions Number of Point Zs 2 Yo S Averaging OSC Signal Level Nav Vos Vosc lt 0 02 EZ x 0 1 0 001x fruma PEZ x 1x 10 2x 10 x frre 1 lt Nav lt 7 f m TOUT 0 02 V lt Vose lt 0 12 0 1 0 001 x fryriz 1x107 2x107 x fnm 0 12 V Vose 0 05 0 001 x fma 1x107 2x 10 xfimHz Vosc lt 0 02 Vex x 0 05 0 001 x fuma PEZ x 8x 10 2x 10 x free 8 lt Nav 5 _7 0 02 V lt Vose lt 0 12 0 05 0 001 x frr 3x10 2x 1077 x fra 0 12 V Vose 0 03 0 001 x fma 3x 107 2x 107 xf 117 1 Vosc 0 12 V lose 3 MA Pose 10 dBm Vosc 0 02 V Insc 0 5 mA Pose 26 dBm At the following frequency points instrument spurious characteristics could occasionally cause measurement errors to exceed specified value because of instrument spurious characteristics 514 645 MHz 42 84 MHz 1327 38666 MHz 21 42 MHz 1029 29 MHz 17 24 MHz 686 19333 MHz 10 71 MHz See EMC under Others in General Characteristics The excessive vibration and shock could occ
337. y disk drive and the memory disk as the storage device DISK shows the floppy disk is selected and TMEMORY shows the memory disk is selected This setting does not change even when the line power is cycled or the key is pressed Auto Recall Function When the analyzer is turned on it looks for a file named AUTOREC from the floppy disk or the memory disk and if found the analyzer automatically reads the file to retrieve its data Instrument State Block 8 39 Limit Line Concept Limit Line Concept These are lines drawn on the display to represent upper and lower limits or device specifications with which to compare the DUT Limits are defined by specifying several segments where each segment is a portion of the stimulus span Each limit segment has an upper and a lower starting limit value Limits can be defined independently for the two channels with up to 18 segments for each channel a total of 36 for both channels These can be in any combination of the two limit types Limit testing compares the measured data with the defined limits and provides pass or fail information for each measured data point An out of limit test condition is indicated in the following ways m Displaying a FAIL message on the screen m Emitting a beep m Displaying an asterisk in tabular listings of data m Writing a bit into bit 3 and 4 of the instrument status resister Limits are entered in tabular form Limit lines and
338. ystem Two different modes are possible system controller and addressable System Controller This mode allows the analyzer to control peripherals directly in a stand alone environment without an external controller This mode can only be selected manually from the analyzer front panel Use this mode for operation when no computer is connected to the analyzer Addressable This is the traditional programming mode in which the external computer is involved in all peripheral access operations When the external controller is connected to the analyzer through GPIB as shown in Figure 8 27 this mode allows the external controller to control the analyzer over GPIB in the talker mode in order to send data and in the listener mode to receive commands Programming information for the addressable mode is provided in the Programming Manual Internal interface CONTROLLER 21 4 91B 17 Select Code 8 IN M O 800 Instrument BASIC HE E gt Ep d 721 717 Parallel I F GPIB Select Code 7 Centronics Compatible PRINTER CE008001 Instrument State Block Figure 8 27 Analyzer Bus Concept GPIB Function Setting Addresses In GPIB communications each instrument on the bus is identified by an GPIB address This address co

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