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1. Figure 6 8 Setup for Measurements to 2 GHz Using a Microwave Converter Audio Analyzer 888858 fas T 210909000 SS 5 INPUT x 55 6 Measuring Receiver DUPLEX OUT MODULATION OUTPUT RF EXT LO INPUT Signal Generator INPUT INPUT 500 A Signal Generator LO F OUTPUT Microwave INPUT OUTPUT RF 9 Converter OUTPUT Procedure NOTE Test Sets with firmware revision A 04 5X and above operate only at RF 156 frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set Steps 1 to 5 in the following procedure apply to both setups shown in figure 6 7 and figure 6 8 on page 156 1 On the signal generator to be used as the measuring receiver s LO a Setthe frequency to 11 5 MHz b Set the level to 0 dBm 2 On the measuring receiver Reset the instrument Set the IF to 1 5 MHz 3 2 Special Set the high pass filter to 50 Hz Set the low pass filter to 15 kHz Set the measurement mode If the instrument has an external LO switch enable the external LO mode 23 1 Special g If the microwave converter is being used set the frequency offset mode to exit the mode 27 0 Special 3 On the audio analyzer a Reset the in
2. page 179 Table 7 19 RF Analyzer Level Accuracy Test 19 Record e Frequency Level Difference Limits dB irmware Revision Lower Upper Actual lt A 02 XX 30 0 314 0 314 lt 02 50 0 314 0 314 lt 02 100 0 314 0 314 lt 02 150 0 314 0 314 lt 02 200 0 314 0 314 lt 02 250 0 314 0 314 lt A 02 XX 300 0 314 0 314 lt 02 350 0 314 0 314 lt 02 400 0 314 0 314 lt 02 450 0 314 0 314 lt 02 500 0 314 0 314 lt 02 550 0 314 0 314 lt 02 600 0 314 0 314 lt 02 650 0 314 0 314 lt 02 700 0 314 0 314 lt 02 750 0 314 0 314 ALL 800 0 314 0 314 ALL 850 0 314 0 314 ALL 900 0 314 0 314 ALL 950 0 314 0 314 ALL 1000 0 314 0 314 ALL 1700 0 334 0 334 ALL 1725 0 334 0 334 236 S agilent e8285 ALR Book chapters perf_record fm Performance Test Records RF Analyzer Level Accuracy Performance Test 19 Record Applicable Level Difference Limits dB Firmware Frequency Revision Lower Upper Actual ALL 1750 0 334 0 334 ALL 1775 0 334 0 334 ALL 1800 0 334 0 334 ALL 1825 0 334 0 334 ALL 1850 0 334 0 334 ALL 1875 0 334 0 334 ALL 1900 0 334 0 334 ALL 1925 0 334 0 334 ALL 1950 0 334 0 334 ALL 1975 0 334 0 334 ALL 2000 0 334 0 334 237
3. Setup Figure 6 17 Audio Analyzer ae Ig goooj le ereeslogao B cy sees O 2008 OUTPUT we Multimeter AUDIO IN HI Procedure 1 Set the digital multimeter to measure AC volts 2 On the Test Set P eo Press Preset Select the AF ANALYZER screen Set the AF Infield to Audio In Set the Filter 1 fieldto 20 Hz HPF Setthe Filter 2 fieldto gt 99kHz LPF Set the De Emphasis field to Off Set the Detector field to RMS Set the Settling field to Slow 3 Set the audio analyzer s source to the frequencies and levels shown in the Performance Test Record Adjust the level until the digital multimeter reads the correct level 4 Measure the AC level on the Test Set and compare the measured level to the limits 171 Performance Tests AF Analyzer Residual Noise Performance Test 13 AF Analyzer Residual Noise Performance Test 13 The purpose of this test is to verify that the Test Set meets the specification limits in Performance Test Record table 7 13 AF Analyzer Residual Noise Test 13 Record on page 230 The AC level of the audio input is measured with no signal source connected Setup Figure 6 18 D 9 9 9 D o 00090 8 O 08 000 9 20000 90000 20080 D ei e
4. 4 RF Level Level Limits dBm Revision Lower Upper Actual ALL RF IN OUT 800 102 103 101 ALL RF IN OUT 800 107 108 106 ALL RF IN OUT 800 112 113 111 ALL RF IN OUT 800 117 118 116 ALL DUPLEX OUT 1000 11 12 10 ALL DUPLEX OUT 1000 16 17 15 ALL DUPLEX OUT 1000 21 22 20 ALL DUPLEX OUT 1000 26 27 25 ALL DUPLEX OUT 1000 31 32 30 ALL DUPLEX OUT 1000 36 37 35 ALL DUPLEX OUT 1000 41 42 40 ALL DUPLEX OUT 1000 46 47 45 ALL DUPLEX OUT 1000 51 52 50 ALL DUPLEX OUT 1000 56 57 55 ALL DUPLEX OUT 1000 61 62 60 ALL DUPLEX OUT 1000 66 67 65 ALL DUPLEX OUT 1000 71 12 70 ALL DUPLEX OUT 1000 16 77 75 ALL DUPLEX OUT 1000 81 82 80 ALL DUPLEX OUT 1000 86 87 85 ALL DUPLEX OUT 1000 91 92 90 ALL DUPLEX OUT 1000 96 97 95 ALL DUPLEX OUT 1000 101 102 100 ALL DUPLEX OUT 1000 106 107 105 ALL DUPLEX OUT 1000 111 112 110 ALL DUPLEX OUT 1000 116 117 115 ALL RFIN OUT 1000 22 23 21 ALL RF IN OUT 1000 27 28 26 ALL RF IN OUT 1000 32 33 31 213 Performance Test Records RF Generator Level Accuracy Performance Test 5 Record 214 E LM RF Level Level Limits dBm Revision Lower Upper Actual
5. Setup Figure 6 16 Counter EERIE 550 S 555 5 m 26 28 995 6 AUDIO OUT Procedure 1 Set the counter to measure frequency 2 On the Test Set a Press Preset b Select the RF GENERATOR screen Set AFGen1 and AFGen2 To fields to Audio Out 3 On the Test Set for Audio Frequency Generator 1 do the following Set the AFGen2 To level field to b Setthe audio frequency and level as shown in the Performance Test Record PTR and measure the audio frequency Compare the measured frequency to the limits 4 On the Test Set for Audio Frequency Generator 2 do the following a Setthe AFGen1 To level field to O f and AFGen2 To level field to on b Set the audio frequency and level as shown in the PTR and measure the audio frequency Compare the measured frequency to the limits 170 S agilent e8285 ALR Book chapters perf_test fm Performance Tests AF Analyzer AC Level Accuracy Performance Test 12 AF Analyzer AC Level Accuracy Performance Test 12 The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 12 AF Analyzer AC Voltage Accuracy Test 12 Record on page 229 To measure AC voltage accuracy an AC signal is measured by an external multimeter and compared to the Test Set s internal AC voltmeter reading
6. 223 Performance Test Records AF Generator AC Level Accuracy Performance Test 8 Record 224 AC Level Limits mV AF Generator os ibi Lower Upper Actual 2 100 4000 3885 000 4115 000 2 100 700 682 500 717 500 2 100 75 70 000 80 000 S agilent e8285 ALR Book chapters perf_record fm Performance Test Records AF Generator DC Level Accuracy Performance Test 9 Record AF Generator DC Level Accuracy Performance Test 9 Record For test procedure see AF Generator DC Level Accuracy Performance Test 9 on page 168 Table 7 9 AF Generator DC Level Accuracy Test 9 Record Level DC Level Limits mV AF Generator mV Lower Upper Actual 1 4000 3870 000 4130 000 1 1000 975 000 1025 000 2 4000 3870 000 4130 000 2 1000 975 000 1025 000 225 Performance Test Records AF Generator Residual Distortion Performance Test 10 Record AF Generator Residual Distortion Performance Test 10 Record For test procedure see AF Generator Residual Distortion Performance Test 10 on page 169 Table 7 10 AF Generator Residual Distortion Test 10 Record 10 Frequency Distortion Limits Upper Actual 1 25000 4000 0 125 1 25000 2000 0 125 1 25000 200 0 125 1 10000 4000 0 125 1 10000 2000 0 125 1 10000 200 0 125 1 1000 4000 0 125 1 1000 2000 0 125 1 1000 200
7. Procedure 1 On the Test Set Press Preset Select the AF ANALYZER screen Set the AF In field to Audio In Set the Filter 1 fieldto lt 20 Hz HPF eo Setthe Filter 2fieldto 15kHz LPF Set De Emphasis field to Set the Detector field to RMS Set the Audio Lofieldto 600 To Hi Bm 2 Measure the AC level residual noise on the Test Set and compare the measured level to the limits shown in the Performance Test Record 3 Filter 2 field to 99kHz LP 4 Measure the AC level residual noise on the Test Set and compare the measured level to the limits shown in the Performance Test Record 172 S agilent e8285 ALR Book chapters perf_test fm Performance Tests AF Analyzer Distortion and SINAD Accuracy Performance Test 14 AF Analyzer Distortion and SINAD Accuracy Performance Test 14 The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 14 AF Analyzer Distortion and SINAD Accuracy Test 14 Record on page 231 A calibrated distortion source is created by summing the two internal audio generators Levels are measured separately by the internal AC voltmeter One source is set to a harmonic two or three times the frequency of the other The measured distortion and SINAD is compared with the calculated value Setup Figure 6 19 AUDIO OUT AUDIO
8. E ld 9338 NYHL Xv i oianv 90 1VNV OIG V 1 123146 100 2 133135 LNSWSYNSVSW 1 1 35 8p 07 0 02 0 0 130 SWH SWH 210 LSNOD 1504 578 210 389 B H210N 0333 STEVINVA 2 Olanv 330 SWNI0A d338 V 1SN02 13538 130 8 07 8 02 0 73 7135 130 2 901VNV oianv Sb bd 1510 COIN 268 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams Audio Analyzer Section Measurement Board Figure 8 13 3 245 DIS 43991 IVNDIS 23dS 1815 dMS 181 dMS 3995 1815 dMS TU 1 0 7 4 oi aq EdDS vs 2 5 12346 o1 4228 VS EZ Ed H 7Z EdjH nod Wosd NI 931 H AS OL 0 01 1no owL H X39911 1X3 H H t ta H 0 U gt 6 2 88 PET x 3 2 e n028227 2 3855 W S 20 18 gt 898 558 2526556 5189 18 62 5 gt lt gt gt gt gt gt gt 2 lt lt 02690535 5 3 58 1999 1939595513913 513 95 4 DO EN bad S U o oj
9. Table 7 16 AF Analyzer Frequency Accuracy to 100 kHz Test 16 Record Frequency Frequency Limits Hz Lower Upper Actual 21 20 896 21 104 100 99 880 100 120 1000 999 700 1000 300 10000 9997 90 10002 10 100000 99979 9 100020 1 233 Performance Test Records AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 Record AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 Record For test procedure see AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 on page 176 Table 7 17 AF Analyzer Frequency Accuracy at 400 kHz Test 17 Record Frequency Difference Limits kHz Lower Upper Actual 0 080 0 080 234 S agilent e8285 ALR Book chapters perf_record fm Performance Test Records Oscilloscope Amplitude Accuracy Performance Test 18 Record Oscilloscope Amplitude Accuracy Performance Test 18 Record Table 7 18 For test procedure see Oscilloscope Amplitude Accuracy Performance Test 18 on page 177 Oscilloscope Amplitude Accuracy Test 18 Record Frequency Amplitude Limits V ii Lower Upper Actual 1 6 765 7 377 10 6 765 7 377 50 5 000 10 000 235 Performance Test Records RF Analyzer Level Accuracy Performance Test 19 Record RF Analyzer Level Accuracy Performance Test 19 Record For test procedure see RF Analyzer Level Accuracy Performance Test 19 on
10. 228 siagilent e8285 ALR Book chapters perf_record fm Performance Test Records AF Analyzer AC Level Accuracy Performance Test 12 Record AF Analyzer AC Level Accuracy Performance Test 12 Record For test procedure see AF Analyzer AC Level Accuracy Performance Test 12 on page 171 Table 7 12 AF Analyzer AC Voltage Accuracy Test 12 Record Level AC Voltage Limits m V Hz mv Lower Upper Actual 15000 5000 4850 00 5150 00 2000 5000 4850 00 5150 00 200 5000 4850 00 5150 00 20 5000 4850 00 5150 00 15000 500 485 00 515 00 2000 500 485 00 515 00 200 500 485 00 515 00 20 500 485 00 515 00 15000 50 48 50 51 50 2000 50 48 50 51 50 200 50 48 50 51 50 20 50 48 50 51 50 229 Performance Test Records AF Analyzer Residual Noise Performance Test 13 Record AF Analyzer Residual Noise Performance Test 13 Record For test procedure see AF Analyzer Residual Noise Performance Test 13 on page 172 Table 7 13 AF Analyzer Residual Noise Test 13 Record Residual Noise Limits Filter 2 Upper Actual 15 kHz LPF 150 299 kHz LP 450 230 S agilent e8285 ALR Book chapters perf_record fm AF Analyzer Distortion and SINAD Accuracy Performance Test 14 Record For test procedure see AF Analyzer Distortion and SINAD Accuracy Performance Test 14 on page 173 Performance Test Re
11. Figure 2 7 First LED Patterns If the first LED pattern Then the failure is displayed is 5 27 ROM Checksum See note 1 3 rapid blink RAM See note 2 Xf steady on or slow blink RAM See note 3 ex Timer eo Real Time Clock e Keyboard stuck key or faulty key down detector Control Interface See note 4 xt Serial Bus Communication see figure 2 8 on page 56 e ex Signaling Board Self Test Display Drive Self Test e e cc Miscellaneous Hardware see figure 2 9 on page 57 NOTES 1 Second and third LED failure patterns 0001 and 0001 for any main ROM failure 0001 and 0002 for boot ROM failure 2 Second and third LED failure patterns 0001 and 0001 for Memory SBRC board RAM failure 0001 and 0002 for Controller board RAM failure 3 Second and third LED failure patterns 0001 and 0001 for Memory SBRC board RAM failure 0001 and 0010 for Memory SBRC board RAM failure 4 Second and third LED failure patterns for Control Interface 0001 and 0001 for Serial Port 9 failure 0001 and 0010 for Serial Port 10 failure 0001 and 0011 for Serial Port 11 failure 0001 and 0100 for Serial Port 14 failure 0001 and 1101 for Parallel Port 15 failure 0001 and 1110 for Parallel Port 16 failure 55 Troubleshooting Self Test Diagnostics Figure 2 8 Non blinking LED Codes For Serial Bus Communicatio
12. 8 100 di ZHWE YH 0 8 95 01 2 5 g add ZHWOL uno Fo nS 330 N0 3 0 8 G di g ass 2 x 7 2 4 Ze 213005 OL 2 7 i Y V wv 130 z 02 8PE mm ELI 9 24 apo 572 SE ap 9 HJ13nos 3 ug Ho nos ZHW LOL 1 zien x n amp 926 i Er a LANI cies 1 Hd 101 401 1 4 w oaz rav rav 136440 V 133890 P 9 m o lt 123135 123135 14 E H313n0S 41 d SV3H NO Y ND DL H3AI303H AwooL lt 1N 3 29004 Receiver Figure 8 5 LN3S3ud 40 10d 03908433 lt 1 33 0268 WOH4 ZHWOOS HANDS ZHWOOS HINAS 0 8 855 133185 100 00 30 13 31 212 05 330 NO 123185 83114 3 123135 141 ca Md ld QWs OW 43LYSANOINMOG WOuS 259 Block Diagrams RF Analyzer Section Figure 8 6 Digital Cellsite 1 amp 2 DIGITAL CELL SITE 1 from PROTOCOL TRIGGERS RP PROCESSOR ADRS DATA FIFO pin 12 B IF GAIN 46xCHIP 20ms NC 8 26 67ms NC 8 5 8xCHIP 8 1 4 is ANALO
13. Audio Analyzer 1 Internal Paths Audio Analyzer 1 External Paths Audio Analyzer 2 5 When a test fails a diagnosis is given in three parts A diagnostic code The name of the assembly or assemblies most likely to have failed e A rating of the confidence high medium or low of the diagnosis This program tests the RF functions of the following assemblies Downconverter RF Output Signal Generator Synthesizer Reference Receiver Receiver Synthesizer Spectrum Analyzer optional RFI O Upconverter Some tests require cabling before the RF Diagnostics can be run but all tests can be run in a loop mode without further intervention Running in loop mode makes it easier to catch intermittent failures To run these diagnostics see RF Diagnostics on page 65 65 Troubleshooting AF RF and CDMA Diagnostics NOTE A fifteen minute warm up is required The measurement limits of the SERVICE4 diagnostic tests are valid only at room temperature that is 20 to 25 C 65 to 75 F NOTE Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set Figure 2 16 RF Diagnostics Screen TESTS IBRSIC Controller SERVICE MENU Move pointer to the desired program using the knob then press the knob
14. 9 06 AUDIO OUT Procedure 1 Set the multimeter to measure DC volts 2 On the Test Set a Press Preset b Select the RF GENERATOR screen Set AFGen1 To and AFGen2 To fields to Audio Out d Set AFGen1 Freqand AFGen2 Freq fieldsto 0 0 Hz e Setthe Audio Out field to DC 3 On the Test Set for Audio Frequency Generator 1 do the following a Set AFGen2 To level field to b Set the audio frequency and level as shown in the Performance Test Record PTR and measure the DC level Compare the measured voltage to the limits 4 On the Test Set for Audio Frequency Generator 2 do the following a Set the AFGen1 To level field to O f and AFGen2 To level field to on b Set the audio frequency and level as shown in the and measure the DC level Compare the measured voltage to the limits 168 S agilent e8285 ALR Book chapters perf_test fm Performance Tests AF Generator Residual Distortion Performance Test 10 AF Generator Residual Distortion Performance Test 10 Setup Figure 6 15 Procedure The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 10 AF Generator Residual Distortion Test 10 Record on page 226 Audio distortion is measured directly with an audio analyzer GES g H ee Se Audio Analyzer ofe
15. Some of the instrument functions in the Test Set include Synthesized AM FM and IQ modulation signal generator e AM FM and IQ modulation analyzer Duplex offset signal generator SSB demodulator RF power meter Audio and RF frequency counter and RF frequency error meter AC and DC voltmeter Distortion SINAD and signal to noise ratio meters Two variable audio sources Oscilloscope Spectrum analyzer and tracking generator optional Signaling encoder and decoder DC current meter 26 S agilente8285 ALR Book chapters intro fm Introduction Test Set Description Some of these functions are directly replaceable assemblies such as the spectrum analyzer some functions are digitally derived from other assemblies such as the oscilloscope Most of the replaceable assemblies are plug in components Most instrument functions can be controlled by front panel local controls and by remote commands using a connected controller Power on off volume and squelch controls cannot be accessed remotely Controls are grouped together on display screens that are usually associated with a specific task such as making a call toa CDMA mobile phone An Instrument BASIC IBASIC controller is also built into the Test Set to allow automated operation without using an external controller This computer also has the ability to be a system controller to other test system instruments Refer to the Test Set s us
16. 3 IESUS H3TION LNOD WOW HSV H 289 Block Diagrams Instrument Control Section Figure 8 28 Display Driver CRT MEAS BUS FROM DCV E 5E eo E e DISPLAY EL DISPLAY TMS34010 16V8 amp 1 40 MHz EPM7032 VIDEO DRAM OKI M514262 290 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams GPIB Serial GPIB Serial Figure 8 29 GPIB Serial GPIB Serial GLUE GPIB Seria ACE ACE TI99C14 TL16PIR552 TL16PIR552 RP NC CTRL_IFACE_BUS SERIAL_9 SERIAL_10 SERIAL_11 SERIAL_14 PARALLEL 16 GPIB PARALLEL 15 291 Block Diagrams GPIB Serial 292 S agilentie8285ALR Book chapt Service Screen This chapter describes the SERVICE screen as a diagnostic aid for the Test Set 293 Service Screen Troubleshooting with the SERVICE Screen Troubleshooting with the SERVICE Screen The SERVICE screen see Figure 9 1 on page 295 uses the internal voltmeter and frequency counter functions to monitor specific nodes in most assemblies A large number of latch and DAC settings used throughout the Test Set can also be read and or set to alter standard operation These functions are primarily intended to allow the automated internal diagnostic routines to verify proper instrument operation and to allow the periodic adjustment routines PER_CAL3 CDMA CAL and PCB CAL
17. 70 SC mcns 79 Disassembly and Replaceable Parts OU Starts cited tiene can de BUE kaw uka 84 Disassembly 87 Peres Lise 105 Functional Verification Periodic Adjustments Calibration Periodic 24 2 126 FAS 355 aya den Cc 129 Running the Periodic IQ or IQ Demod Path Calibration Programs 130 Periodic Calibration Menu Descriptions 131 Setting the Timebase Latches 135 IQ Calibration Program Description 137 IQ Demod Path Calibration Program Description 139 Performance Tests Procedure and Equipment 142 RF Generator FM Distortion Pertormastce Test I gain stad erates See ee ER Re dade 146 RF Generator FM Accuracy Performance Test 2 149 RF Generator FM Flatness Pertermatce Test 152 RF Generator Residual FM Performance Testd oad itch we 155 RF Generator Level Accuracy 21 Contents Performance T 22 Contents 7 Performance Test Records RF Generator FM Distortion Performance Test 1 Record x xao c ER earns RF Generator FM Accuracy Performance Test 2 Record sec die ce im nd ERE RF Generator FM Flatness
18. Diagnostics CDMA Gen SERVICE7 Yes Reference Ref IQ Modulator Receiver RF Diagnostics Receiver RF Analyzer Yes FM Accuracy Power Supply No Spectrum RF Diagnostics Spectrum Spectrum Analyzer Yesd Analyzer optional Analyzer Control Functional Diagnostics Self Test No Interface Modulation AF Diagnostics Mod AF Generator AC Level Periodic Yes Distribution Distribution Internal Paths Accuracy Calibration AF Gen Gain EXT Mod Path Gain Audio AF Diagnostics Audio Analyzer 1 SERVICE7 Periodic Yes Analyzer 1 Internal Paths Calibration Audio Analyzer Offset Audio AF Diagnostics Audio AF Analyzer SERVICE7 Periodic Yes Analyzer 2 Analyzer 2 AC Voltage Accuracy Calibration VEN Measurement Functional Diagnostics Self Test Oscilloscope SERVICE7 Yesf Periodic Calibration Voltmeter Reference Motherboard No a See Chapter 6 Performance Tests on page 141 b See Chapter 5 Periodic Adjustments Calibration on page 125 c See table 5 1 Assembly Calibration Information on page 127 of Chapter 5 Periodic Adjustments Calibration d PCMCIA smart card supplied with kit f PCMCIA smart card supplied with kit Measurement checked indirectly by all diagnostics 71 Troubleshooting Manual Troubleshooting Procedures Verify Test Set s Reference Path Out of Lock OOL LEDs Out of lock OOL LEDs light when a phase locked loop inside an assembly is failing The sig
19. Humber Upper Actual ALL 11 900 2nd 18 000 ALL 11 900 3rd 18 000 ALL 11 1000 2nd 18 000 ALL 11 1000 3rd 18 000 ALL 12 1700 2nd 18 000 ALL 12 1700 3rd 18 000 ALL 12 1800 2nd 18 000 ALL 12 1800 3rd 18 000 ALL 12 1900 2nd 18 000 ALL 12 1900 3rd 18 000 ALL 12 2000 2nd 18 000 ALL 12 2000 3rd 18 000 220 siagilent e8285 ALR Book chapters perf_record fm Performance Test Records RF Generator Spurious Spectral Purity Performance Test 7 Record RF Generator Spurious Spectral Purity Performance Test 7 Record For test procedure see RF Generator Spurious Spectral Purity Performance Test 7 on page 165 Table 7 7 RF Generator Spurious Spectral Purity Test 7 Record Spurious Signal Limits Spurious Source pis pus ame Upper Actual Supply 1000 1080 60 00 Supply 1000 999 89 60 00 Supply 1000 1130 60 00 Supply 1800 1880 55 00 Supply 1800 1799 89 55 00 Supply 1800 1930 55 00 1 Gz Mix 999 9995 1000 0145 60 00 1 Gz Mix 999 9995 999 9795 60 00 1 Gz Mix 999 9995 1000 0245 60 00 1G 1700 2700 55 00 MX 1G 1799 27799 55 00 8G 1850 2650 55 00 FDTHIX 1799 1000 55 00 FDTHIX 1850 800 55 00 DCDMA 1700 1 2288 55 00 DCDMA 1850 1 2288 55 00 DREF5 1700 5 55 00 DREF5 1850 5 55 00 MX CDMA 1700 1701 2288 55 00 MX CDMA 1700 1698 7712 55 00 MX CDMA
20. 3 Connect a frequency counter to the rear panel 10 MHz REF OUTPUT connector Select the Latch field Select refs DAC coarse under the Choices menu Select the Value field Rotate the knob until the counter reads as close to 10 MHz as possible Select the Latch field Select refs_DAC fine under the Choices menu 135 Periodic Adjustments Calibration Setting the Timebase Latches 10 Select the Value field 11 Rotate the knob until the counter reads as close to 10 MHz as possible 12 Store the new DAC values timebase calibration data in non volatile memory by selecting and running the Timebase Reference Using a Counter routine from the Periodic Calibration Menu See Timebase Reference Using a Counter on page 132 136 siagilent es285 ALR Book chapters period_adj fm Periodic Adjustments Calibration IQ Calibration Program Description IQ Calibration Program Description The goal of IQ Calibration see Figure 5 6 on page 138 is to minimize the carrier feedthrough while maximizing the Rho of the IQ signal There are four DACs involved in this adjustment buffModN I DC offset DAC buffModN Q DC offset DAC buffModN signal delta DAC genRef IQ quad DAC The I and Q dc offset DACs and the signal delta DAC are on the Data Buffer assembly and the Quad DAC is on the CDMA Generator Reference These DACs can be accessed in the list of Latches on the SERVICE screen All the DACs are initially s
21. Qatar Seychelles Sierra Leone Singapore Southern Asia Southern Pacific Islands St Helena Sudan Tanzania Uganda United Arab Emirates United Kingdom Yeman Aden amp Sana 18 S agilent e8285 ALR Book chapters front fm Table 12 Plug Type Plug Descriptions male female Agilent Part cable amp plug Cable Descriptions Straight Straight Straight 90 8120 1369 8120 0696 79 inches gray 80 inches gray Used in the following locations Argentina Australia China People s Republic New Zealand Papua New Guinea Urugray Western Samoa 19 20 ATTENTION Static Sensitive Devices This instrument was constructed in an ESD electro static discharge protected environment This is because most of the semi conductor devices used in this instrument are susceptible to damage by static discharge Depending on the magnitude of the charge device substrates can be punctured or destroyed by contact or mere proximity of a static charge The result can cause degradation of device performance early failure or immediate destruction These charges are generated in numerous ways such as simple contact separation of materials and normal motions of persons working with static sensitive devices When handling or servicing equipment containing static sensitive devices adequate precautions must be taken to prevent de
22. Denmark Greenland 16 S agilent e8285 ALR Book chapters front fm Table 9 Plug Type Plug Descriptions male female Agilent Part cable amp plug Cable Description Straight Straight Straight 90 8120 4211 8120 4600 79 inches mint gray 79 inches mint gray Used in the following locations Botswana India Lesotho Malawi South West Africa Namibia Switzerland Zambia Zimbabwe Table 10 Plug Type Plug Descriptions male female Agilent Part cable amp plug Cable Descriptions Straight Straight Straight Straight Straight 90 Straight 90 8120 1860 8120 1575 8120 2191 8120 4379 60 inches jade gray 30 inches jade gray 60 inches jade gray 15 5 inches jade gray Used in the following locations System Cabinets 17 Table 11 Plug Type Male Plug Descriptions male female Agilent Part cable and plug Cable Descriptions 90 Straight 90 90 8120 1351 8120 1703 90 inches mint gray 90 inches mint gray Used in the following locations Bahrain British Indian Ocean Terr Brunei Canton Cyprus Enderbury Island Equatorial Guinea Falkland Islands French Pacific Islands Gambia Ghana Gibraltar Guinea Hong Kong Ireland Kenya Kuwait Macao Malaysia Mauritius Nigeria
23. For Select Procedure Filename select SERVICE7 Press the K1 key The SERVICE MENU appears Load and execute each of the following diagnostic and calibration programs o uU B5 Under Funcional Diagnostics select RF Modules Analog Modulation and CDMA Loopback AF Diagnostics RF Diagnostics CDMA Diagnostics IQ Calibration IQ Demod Path Calibration Disregard all other diagnostic or calibration programs that appear on the SERVICE MENU and are not listed in step 6 7 Load and execute PCB_CAL program Pressthe Tests key to access the TESTS Main Menu screen For Select Procedure Location select ROM e For Select Procedure Filename select CAL Press K1 to execute 8 Record results in the Table 4 1 on page 123 118 S agilent e8285 ALR Book chapters verif fm Figure 4 1 TESTS Moin Menu SERVICE LORD TEST PROCEDURE Select Procedure Location acedure Filename DURE Pa Test Parameters Pass Fail Limits Save Delete Procedu Chapter 4 Functional Verification ROM Based Diagnostics and Calibration SERVICE MENU 1 TEE raContinue tele ___ Program ROM Library N0 LIBI To Screen e COMA SET UP TEST SET Analog 434 Execution Cond TESTS IBASIC Controller 1 SERVICE MENU Move pointer to the desired program using the knob then press the knob
24. O00 oong 5 Doon 008 5 oleenH AUDIO OUT Set the multimeter to measure AC volts On the Test Set a Press Preset b Select the RF GENERATOR screen c Setthe AFGen1 and AFGen2 fields to Audio Out On the Test Set for Audio Frequency Generator 1 do the following a Setthe AFGen2 To level field to O f b Set the audio frequency and level as shown in the Performance Test Record PTR and measure the AC level Compare the measured voltage to the limits On the Test Set for Audio Frequency Generator 2 do the following Setthe AFGen1 To level field to and AFGen2 To level field to On b Setthe audio frequency and level as shown in the PTR and measure the AC level Compare the measured voltage to the limits 167 Performance Tests AF Generator DC Level Accuracy Performance Test 9 AF Generator DC Level Accuracy Performance Test 9 The purpose of this test is to verify that the Test Set meets the specification limits in Performance Test Record table 7 9 AF Generator DC Level Accuracy Test 9 Record on page 225 There are two DC generators DC level accuracy is measured directly with a digital multimeter Setup Figure 6 14 e Multimeter 6feeeloooo O 26 INPUT
25. 01 265 Block Diagrams Audio Analyzer Section Audio Analyzer Section Input Level Control Switchable gain amplifiers on the Audio Analyzer 1 and Audio Analyzer 2 figure 8 11 on page 267 and figure 8 12 on page 268 assemblies keep the audio input signal within a range suitable for the detectors AC and DC Level Measurements Detected voltages from the Peak Peak and RMS detectors are measured on the Measurement assembly The Controller calculates the displayed value taking into account the detector selected from the front panel the gain of the amplifiers and the source of the input signal demodulators front panel Distortion and SINAD Measurements Distortion and SINAD can be measured on 300 Hz to 10 kHz audio signals The Controller calculates distortion and SINAD by comparing the ratio of the voltage after the variable notch filter to the ratio of the voltage before the notch filter Oscilloscope Functions The Test Set has no specialized oscilloscope assemblies The and Audio Analyzer assemblies Measurement assembly figure 8 13 on page 269 and the Controller figure 8 27 on page 289 work together to perform the oscilloscope functions The audio or dc signal to be displayed goes from the Audio Analyzer 2 assembly to a sampler on the Measurement assembly the same sampler used by the Spectrum Analyzer The Controller calculates the display level by taking the value of the measured signal at each poin
26. 3 Record the Avg Pwr reading in the PTR see table 7 29 CDMA Analyzer Average Power Level Accuracy Test 28 Record on page 246 4 Repeat steps 2 and 3 for each of the frequencies and levels listed in the PTR 197 Performance Tests CDMA Analyzer Channel Power Level Accuracy Performance Test 29 CDMA Analyzer Channel Power Level Accuracy Performance Test 29 The purpose of this test is to verify that the Test Set meets the specification limits in Performance Test Record table 7 30 CDMA Analyzer Channel Power Level Accuracy Test 29 Record on page 247 The tuned channel power level accuracy is verified by comparing the measured power in a CW signal with the power level measured by a measuring receiver Setup Figure 6 34 CDMA Analyzer Channel Power Level Accuracy Test 28 Signal Generator Amplifier 2 OUTPUT Q Sensor Module Measuring Receiver INPUT 500 Procedure 1 On the measuring receiver a Set the display mode to LOG b Set the measurement mode to RF POWER c Calibrate the power sensor 2 On the signal generator a Setthe frequency to 836 52 MHz 45 MHz below RF generator frequency b Set the output level so the measuring receiver reads 11 dBm S agilent e8285 ALR Book chapters perf_test fm 198 NOTE Performance Tests CDMA Analyzer Channel Power Level Accuracy Performance Test 29
27. CONFIGURE screen and set the Mode field to Control 5 Under PAGE CONTROL set the Lines Page and Form Feed FF at Start and FF at End parameters if necessary S agilent e8285 ALR Book chapters trouble fm Troubleshooting Functional Diagnostics Figure 2 13 SERVICE7 Program Screens TESTS Mani Menu TESTS Main Menu RF Diagnostics SERVICE raContinue TESTS IBRSIC Controller 1 LOAD TEST PROCEDURE Select P d L tion Help ee kasa Move the pointer to the desired test using the 2 Select Procedure Filename Library Program knob then press the knob Press Sery Menu to NO LIB ROM 1 4 to the Service Menus Exit to abort To Screen Description RF Modules 3 Launches diagnostic and calibration mrosrans e Rnalos Modulation COMA Loopback Self Test CUSTOMIZE TEST PROCEDURE SET UP TEST SET O Rnalos Power Supplies EE Execution Cond External Devices Printer Setup Confia exit IBASIC Cntrl CONFIG Channel Information WE Test Paraneters Order of Tests Pass Fail Limits Save Delete Procedure SERVICE MENU TESTS IBASIC Controller Audio Diagnostics SERVICE MENU TESTS IBASIC Controller Move pointer to the desired program using the ji knob then press the knob Press Help for information on the tests Press Exit to abort EN Move
28. Procedure 1 NOTE Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set Steps 1 to 5 in the following procedure apply to Setup 1 shown in figure 6 9 on page 158 1 Before connecting the Test Set to the measuring receiver a Reset the instrument b Zero and calibrate the sensor module 158 S agilent e8285 ALR Book chapters perf_test fm Performance Tests RF Generator Level Accuracy Performance Test 5 NOTE Make sure the sensor module s calibration data is entered into the measuring receiver 2 Connect the equipment as shown in Setup 1 whether intending to measure frequencies to 1 GHz or 2 GHz 3 On the measuring receiver a b Set the measurement mode to RF Power Set the display to log 4 On the Test Set of a Press Preset b Select the CONFIGURE screen Set the RF Display field to Freq Set the RF Offset to Set the Output Port field to Select the RF GENERNATOR screen Set the RF Gen Freq field to the appropriate RF frequency based on the firmware revision see NOTE above from the Performance Test Record Set the Amplitude to 11 dBm 5 For each frequency in the Performance Test Record PTR do the following a Set the measuring receiver to measure frequency b Set the
29. 10 Demod Pat TESTS IBASIC Controller Move the pointer to the desired test using the knob then press the knob Press Serv Menu to go to the Service Menus Exit to abort Periodic Calibration Menu gt Timebase Reference Using a Counter Tinebase Reference Usina a Source Voltmeter References Audio Freauency Generator Gain External Modulation Path Gain Audio Analyzer 1 Offset Variable Freauency Notch Filter Serv Menu 131 Periodic Adjustments Calibration Periodic Calibration Menu Descriptions Timebase Reference Using a Counter This program is used to manually tune the timebase reference using a frequency counter as the time standard This procedure has two basic steps 1 Coarse and fine manual adjustment of the two timebase tuning DACs 2 Downloading the DAC settings into the Test Set If you have not already adjusted the two timebase tuning DACs exit the program if needed by selecting the Adj user key and follow the instructions in Setting the Timebase Latches on page 135 If you have adjusted the timebase DACs run this program and select the Cal user key to make the setting permanent As an alternate method you can select the option Timebase Reference Using a Source see following section and adjust the timebase to a time standard connect to the front panel ANTENNA IN connector Timebase Reference Using a Source This program automatically tunes the timebase tuning DACs to the signal at the front
30. 88 89 87 ALL DUPLEX OUT 1700 93 94 92 ALL DUPLEX OUT 1700 98 99 97 ALL DUPLEX OUT 1700 103 104 102 ALL DUPLEX OUT 1700 108 109 107 ALL DUPLEX OUT 1700 103 114 112 ALL DUPLEX OUT 1700 118 119 117 ALL RF IN OUT 1700 23 24 25 21 75 ALL RF IN OUT 1700 28 29 25 26 75 ALL RF IN OUT 1700 33 24 25 31 75 ALL RF IN OUT 1700 38 39 25 36 75 ALL RF IN OUT 1700 43 44 25 41 75 ALL RF IN OUT 1700 48 49 25 46 75 ALL RF IN OUT 1700 53 54 25 51 75 ALL RF IN OUT 1700 58 59 25 56 75 ALL RF IN OUT 1700 63 64 25 61 75 ALL RF IN OUT 1700 68 69 25 66 75 ALL RF IN OUT 1700 73 74 25 71 75 ALL RF IN OUT 1700 78 79 25 76 75 ALL RF IN OUT 1700 83 84 25 81 75 ALL RF IN OUT 1700 88 89 25 86 75 ALL RF IN OUT 1700 93 94 25 89 75 ALL RF IN OUT 1700 98 99 25 96 75 ALL RF IN OUT 1700 103 104 25 101 75 ALL RF IN OUT 1700 108 109 25 106 75 215 Performance Test Records RF Generator Level Accuracy Performance Test 5 Record E LM RF Level Level Limits dBm Revision Lower Upper Actual ALL RF IN OUT 1700 113 114 25 111 75 ALL RF IN OUT 1700 118 119 25 116 75 ALL DUPLEX OUT 2000 13 14 12 ALL DUPLEX OUT 2000 18 19 17 ALL DUPLEX OUT 2000 23 24
31. Performance Test 3 Recor l scusa ko xxx HR C Ea RF Generator Residual FM Performance Test 4 Record sassa RF Generator Level Accuracy Performance Test 5 Record RF Generator Harmonics Spectral Purity Performance Test 6 55 5 RF Generator Spurious Spectral Purity Performance Test 7 iss xx OR ea AF Generator AC Level Accuracy Performance Test 8 Record dk AF Generator DC Level Accuracy Performance Test 9 Record AF Generator Residual Distortion Performance Test 10 Record AF Generator Frequency Accuracy Performance Test 11 AF Analyzer AC Level Accuracy Performance Test 12 AF Analyzer Residual Noise Performance Test 13 Record AF Analyzer Distortion and SINAD Accuracy Performance Test 14 AF Analyzer DC Level Accuracy Performance Test 15 AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 Record AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 Oscilloscope Amplitude Accuracy Performance Test 18 Record RF Analyzer Level Accuracy Performanc
32. RF Generator Section JY8S WIW 5 woud 14353 333 3301 40 100 dS 31242 W3 W320 W32V 50 gt 100 Z ZHASZ 20 4160 gow gow 39 915 LYVLS d33MS _ 1 02 NIVD 1N3S3Hd oo cc oo 2 2 2 1 m xx gt MIND Old 30 338 woud ZHWOOSL QNV8 30 110 Av130 Signal Generator Synthesizer HLNAS 39 95 Figure 8 21 281 Block Diagrams RF Generator Section RF Output Section Figure 8 22 43LYSANOIdN WOU 9 L307 1n0 d 43LYSANOIdN WON 1387 1 caw 0 j28euuo ON 1 b Ed Ju8S W3H cow SV3W OL 334 O 9 E Ed 715 02 NOILVINGOW Sey 130 QE 19 39 y E 3AMG 390 3AMO 41 1 GOW 54 1 ova O 3H A 41 150 WY TAT LNdLNO Po o HHHO lt 9 1D ZHW OSOL 00Z ava A 2H0 NO ZHOL V 399 ZHOL ET a 01 NOIL23S 109110 Qva N 07 2 9 388 0268 eee 4001 9 J SNDDVSL L O ass
33. 1890 52 7 50 9 35 5 65 1890 52 9 10 85 9 15 244 siagilent e8285 ALR Book chapters perf_record fm CDMA Generator Modulation Accuracy Performance Test 27 Record Performance Test Records CDMA Generator Modulation Accuracy Performance Test 27 Record For test procedure see Generator Modulation Accuracy Performance Test 27 on page 194 Table 7 28 CDMA Generator Modulation Accuracy Test 27 Record 1 Calculated Rho RF MHz Level dBm EVM rms Lower Limit Actual 881 52 10 0 97 1956 25 10 0 97 245 Performance Test Records CDMA Analyzer Average Power Level Accuracy Performance Test 28 Record CDMA Analyzer Average Power Level Accuracy Performance Test 28 Record Table 7 29 246 For test procedure see CDMA Analyzer Average Power Level Accuracy Performance Test 28 on page 196 CDMA Analyzer Average Power Level Accuracy Test 28 Record RF Level Measured Level Limits mW Lower Upper Actual 881 52 0 0 343 0 318 881 52 10 10 39 9 65 1956 25 0 0 366 0 338 1956 25 10 10 41 9 63 S agilent e8285 ALR Book chapters perf_record fm Performance Test Records CDMA Analyzer Channel Power Level Accuracy Performance Test 29 Record CDMA Analyzer Channel Power Level Accuracy Performance Test 29 Record For test procedure see CDMA Analyzer Channel Power Level
34. Performance Test Records RF Analyzer FM Accuracy Performance Test 20 Record RF Analyzer FM Accuracy Performance Test 20 Record Table 7 20 For test procedure see RF Analyzer FM Accuracy Performance Test 20 on page 180 RF Analyzer FM Accuracy Test 20 Record FM Deviation Limits kHz RF Deviation Rate MEZ Lower Upper Actual 840 1 1 0 950 1 050 840 1 10 0 950 1 050 840 10 1 9 500 10 500 840 10 10 9 500 10 500 1000 1 1 0 950 1 050 1000 1 10 0 950 1 050 1000 10 1 9 500 10 500 1000 10 10 9 500 10 500 238 S agilent e8285 ALR Book chapters perf_record fm RF Analyzer FM Distortion Performance Test 21 Record Table 7 21 Performance Test Records RF Analyzer FM Distortion Performance Test 21 Record For test procedure see RF Analyzer FM Distortion Performance Test 21 on page 182 RF Analyzer FM Distortion Test 21 Record FM Deviation FM Distortion Limits Actual 5 1 000 25 1 000 75 1 000 239 Performance Test Records RF Analyzer FM Bandwidth Performance Test 22 Record RF Analyzer FM Bandwidth Performance Test 22 Record For test procedure see RF Analyzer FM Bandwidth Performance Test 22 on page 184 Table 7 22 RF Analyzer FM Bandwidth Test 22 Record FM Deviation Difference Limits dB Upper Actual 3 0 240 S agilent e8285 ALR Bo
35. Power up the Test Set to run self diagnostics i i 1 Check for a faulty fan YES Fan is not running or YES p Is display blank a lt gt does Test Set shut off dM 2 Check for a faulty power supply NO NO after a few seconds 3 Check for a faulty assembly pulling down line voltage 1 Check EL Display or ribbon cable 2 Check display driver YES Does a self test error Refer to Reading Front Panel or GPIB Codes on page 51 NO message appear Is error code SRBC YES Turn off Test Set and remove external or miscellaneous and internal top covers Power up Test NO hardware related Set and read Status LEDs for Self Test errors Refer to Reading LED Codes lt 53 Run the Functional Diagnostics on YES Repair T 2 epair Test Set according the SERVICE MENU See AF RF Problem detected M io the diagnostic CDMA Diagnostics on page 64 NO recommendations N If you still suspect a problem use the TES Repair Test Set according manual troubleshooting procedures gt to findings See Manual Troubleshooting NO Procedures on page 70 m Perform the functional verification tests refer to Chapter 4 Functional Verification on page 111 All OK YES lt 47 Troubleshooting Self Test Diagnostics Self Test Diagnostics On power up the Test Set runs a diagnostic self test Most of the Test Set s dig
36. TheMeasurement assembly measures and displays the modulation level such as FM deviation and provide the input to the oscilloscope TheSignaling Source Analyzer assembly for signaling decoding Therear panel AUD MONITOR OUTPUT connector for external use of the demodulated signal Thefront panel VOLUME control and internal speaker to listen to the demodulated signal AM FM and SSB Signal Demodulation and Filtering Audio Analyzer 1 Assembly 114 3 MHz IF 3 Filters i 230 kHz FM Demod 9 i Filters IF Filters DC Volts and AUDIO IN Audio Frequency centered around 10 7 MHz L front panel Measurements eoero _ Selectable Selectable amp P m VN SSB Demod igh Pass Low Pass Audio Analyzer 2 Assembly RMS RMS SQRT2 Pk Pk Selectable Detectors a oa Variable Freq K Notch Filter Signaling Source Analyzer M RMS AUD MONITOR OUTPUT Rear panel Detector Measurement Assembly 31 Introduction Product Description Signal Analysis The 114 3 MHz IF also goes to the CDMA LO IF Demodulation assembly This assembly provides a through path to the spectrum analyzer Option 102 for all RF signals and also provides down conversion for CDMA signals measurements and call proces
37. 1400 MHZ 2200 MHz tunable bandpass Modulation Measurement The Receiver assembly see Figure 8 5 on page 259 demodulates the I F into its FM AM and SSB components The demodulated signal 15 sent to the Audio Analyzer section for measurement 256 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams RF Analyzer Section Downconverter Figure 8 3 XAJ OL pasn dW31 LADO AVS WSt MEZI 21 21 1 20 28985 43 8 2 225 5 25i ray u 9 380 d m R gs 4 13538 BONY 135347130 1 2715 MS HIN HMd OL YLW HMd ld OL 13070NY9 jl a LAIG 3SuvO 08432 130 TLNITYLW Md 9 9 NM ZHW00Z 195 N311V 4 SYOLV1ND3Y SH3AL NS 5 AS AS 6 6 35 35 XNW OL lt 4 9 8 2 7185 01 300W TWWYON 136 Hivd o1 AVSt J3H AS 34781 DVIQ JH 8H 72 TRAST OT 780 lt T gt ZHWOZ9L 00Z ugp0 gt BOVLIOA 35470 08482 130 52 0 701 03395 1 03933
38. 49 Tol Q Modulator Assembly 29 Introduction Product Description RF Analysis CAUTION Figure 1 3 RF RF signals connected tothe front panel RF IN OUT connector or ANTENNA IN connector go tothe RF 1 0 module The signal level and RF frequency are measured and the level is adjusted using fixed step and variable attenuators in the separate downconverter module Over Power Damage The ANTENNA IN connector is only used for very low level signals 60 mW or less and cannot be used for Transmitter TX Power measurements Exceeding this limit may destroy the RF 1 0 module TheRF IN OUT connector is used to measure direct mobile transmitter power up to 2 5 Watts continuous The downconverter mixes the input signal with a local oscillator signal from the Receiver Synthesizer assembly to produce a 114 3 MHz 614 3 or 385 7 MHz IF signal depending on the frequency of the received signal The signal goes through a bandpass filter and then on tothe Receiver assembly If the is 614 3 or 385 7 MHz the Receiver assembly mixes the signal with a 500 MHz local oscillator LO signal from the Reference assembly to obtain the 114 3 MHz IF If the IF is 114 3 MHz the signal bypasses this downconversion The 114 3 MHz signal divides into two paths Received Signal Downconversion Downconverter 1200 1700 MHz from Receiver Synthesizer Assembly 385 7 2 Receiver Assembly RF IN OUT
39. Assemblies RBN 34CNDCT 28AWG CA AY RBN CONTROLLER KIT CAL MODULE Not included in part list controller3 eps 91 Disassembly and Replaceable Parts Disassembly Procedures Batteries Memory and Regulator Assemblies Figure 3 6 MEMORY SRBC KIT Assembly MEMORY SRBC KIT BTRY 3 0V 1 Figure 3 7 REGULATOR KIT Assembly BTRY 3 0V 12 REGULATOR KIT 92 s agilent e8285 ALR Book chapters disassembly fm Disassembly and Replaceable Parts Disassembly Procedures Bottom Side Assemblies 1 Remove the external and internal cover see External and Internal Covers on page 87 2 Use Figure 3 8 through Figure 3 13 to identify and remove the assembly desired Figure 3 8 Bottom Side Assemblies RBN 20CNDCT_28AWG 26 SR 3 58 SMA SMA 25 BRACKET RFIO SPDT SW CX SMB SMB 170 CX 5 5 530 58 3 58 SMA SMA 22 RBN_20CNDCT_28AWG 26 SR_2 18 SMA SMA 24 RBN_68CNDC30AWG CX_F_SMB SMB 530 SR_2 18 SMA SMA 28 CX_A06A06 120 Front Panel RBN_20CNDCT_28AWG 40 PCMCIA_CARD_READER_KIT 93 Disassembly and Replaceable Parts Disassembly Procedures Figure 3 9 Bottom side Subassemblies DNCONV_KIT RF IO KIT m COAXIAL SPDT SW UPCONV PCMCIA CARD READER KIT i CHASSIS AY BOX BRACKET RELAY MOTHERBOARD NOTE Thereis a combined MOTHERBOARD CHASSIS KIT 94 S3agilente8285 ALRBook chapters disassembly fm D
40. Instrument Frequency References The Test Set reference ti mebase path consists of two assemblies an ovenized high stability reference assembly and a CDMA reference assembly These two assemblies provide all frequency phase and timing signals used to accurately synthesize all of the Test Set s source and analysis signals A master reference signal can originate from either an external source at the 10 MHz input on the rear panel or from the internal 10 MHz phase locked loop oscillator located on the high stability reference assembly The high stability reference assembly provides timebase references for the analog assemblies and a 10 MHz reference signal tothe CDMA reference assembly The CDMA reference assembly uses this signal to generate clock and timing signals for internal CDMA assemblies provide the 10 MHz output signal to the rear panel and generate the AWGN Additive White Gaussian Noise I amp Q noise source signals 28 Sagilente8285 ALR Book chapters intro fm Figure 1 2 Rear Panel External Referenceln OCXO High Stability 1 2 5 10 MHz Rear Panel External ReferenceOut a CDMA Reference 10 MHz Reference Signal Generation Reference Assembly 10 MHzIn Assembly AWGN Introduction Product Description To internal analog assemblies See block diagrams for more information Tointernal digital assemblies See block diagrams for more information
41. Key in the LO frequency in MHz which is 1500 6 On the Test Set for frequencies of 1700 and 2000 MHz measure the FM distortion at the deviations shown in the and compare the measured distortion to the limits 148 S agilent e8285 ALR Book chapters perf_test fm Performance Tests RF Generator FM Accuracy Performance Test 2 RF Generator FM Accuracy Performance Test 2 The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 2 RF Generator FM Accuracy Test 2 Record on page 204 The FM accuracy of the RF generator is measured directly by the measuring receiver The Test Set s internal audio generator provides the modulation source NOTE Two setups are shown below The first setup can measure signals to 1 GHz Since the FM generator in the Test Set translates FM in the lower band directly into the 1 7 to 2 GHz range testing to 1 GHz is adequate when verifying a repair The second setup has a microwave converter which covers the full measurement range of FM signals to 2 GHz Initial Setup Figure 6 3 Setup for Measurements to 1 GHz a Measuring Receiver s 282288 INPUT 500 DUPLEX OUT Figure 6 4 Setup for Measurements to 2 GHz Using a Microwave Converter GE Measuring Receiver 0 108030 o
42. Press Help for information on the tests Press Exit to abort gt Functional Diagnostics AF Diagnostics RF Diasnostics COMA Diagnostics Edit Diagnostic Limits Periodic Calibration IQ Calibration sE IQ Demod Path Calibration TESTS IBRSIC Controller H Move the pointer to the desired test using the knob then press the knob Press Service Menu to 90 to the Service Menus Exit to abort Run at room temperature after 15 minute warhup gt All RF Tests E RF Diagnostics Reference Sisnal Generator Synthesizer Receiver Synthesizer Output serv Menu Upconverter RF Input Output Down Converter Spectrum Rnalyzer sas Receiver When a test fails a diagnosis is given as Sometimes a diagnostic code The name of the assembly or assemblies most likely to have failed Sometimes a rating high medium or low of the confidence of the diagnosis 66 S agilent e8285 ALR Book chapters trouble fm Troubleshooting AF RF and CDMA Diagnostics CDMA Diagnostics NOTE Figure 2 17 The Digital Diagnostics test the assemblies required for CDMA formatted IQ modulation These assemblies include Reference LO IF Demod IQ Modulator CellSite Analog The CDMA Reference LO IF Demod and I Q Modulator are also used when generating or analyzing analog signals Before ordering a replacement assembly Before ordering an assembly bas
43. Press Help for information on the tests Press Exit to aborte gt Functional Diagnostics AF Diagnostics RF Diagnostics Help COMA Diagnostics Edit Diagnostic Limits Periodic Calibration 10 Calibration 5 Denod Path Calibration 119 Functional Verification Channel Power Calibration Channel Power Calibration To ensure the accuracy of the Test Set power measurement channel power calibration should be run before the mobile phone functional test portion of the performance verification test plan 1 Press the Preset key to configure instrument to default settings 2 Connect a short RF cable between the RF IN OUT port and DUPLEX OUT port 3 Calibrate the channel power measurement Press the CDMA SCREENS Call control key Set RF Chan Stdfieldtous Pcs Set Avg Power field to Chan Power Placethe cursor on the Power Meas field and select Calibrate Press the knob or Enter key to begin calibration routine 4 Recordresults in the Table 4 1 on page 123 Suggestion Store instrument settings as a Save Recall register press the Save key register CPWR CAL 120 S agilent e8285 ALR Book chapters verif fm NOTE Functional Verification CDMA Mobile Phone Functional Test CDMA Mobile Phone Functional Test 1 Connect the mobile phone to the Test Set 2 Setup for call processing Knowledge of the mobile s System I D RF Channel and RF Channel capability are essential to call processing T
44. Press the knob or Enter key to begin calibration routine Press the Yes key to continue the calibration routine 4 Perform the Channel Power Loopback Measurement e Place cursor the Sctr A Pwr field Step the Sctr A Pwr level from 5 to 60 dBmin 5 dB increments Measured channel power should be within a few dB of the sector power output level setting The I deal Mobile Power value 15 not applicable for this test 5 Record results in Table 4 1 on page 123 Suggestion Store instrument settings as a Save Recall register press the Save key the register CPWR LB Chapter 4 117 NOTE Functional Verification ROM Based Diagnostics and Calibration ROM Based Diagnostics and Calibration Comprehensive internal IBASIC diagnostics are provided to aid in troubleshooting the Test Set These diagnostic programs use external cabling and the internal measurement and path setting capabilities of the Test Set to diagnose itself for RF and audio hardware problems No external test equipment is necessary As the diagnostic programs execute detected problems will be reported with a suggested defective assembly and it s probability of failure Refer tothe appropriate Assembly L evel Repair section for more information 1 Press the Preset key to configure instrument to default settings 2 Press the Tests key to access to TE STS Main Menu screen see Figure 4 1 on page 119 For Select Procedure Location select ROM
45. Real Time Clock Memory 0040 64 Keyboard stuck key Keypad 0080 128 RS 232 Memory SBRC 0100 256 Serial Bus Communication Any Non Optional assembly P 0200 512 Signaling Board Self Test Signaling Source Analyzer 0400 1024 Display Drive Self Test Display Drive 0800 2048 Miscellaneous Hardware Several Possible Assemblies 1000 4096 a Could also be the digital controller with a faulty key down detector b This checks the ability of the digital controller to communicate with any hardware on the bus c This message occurs if expected hardware is absent or not responding to the digital controller 52 S agilent e8285 ALR Book chapters trouble fm Troubleshooting Self Test Diagnostics Reading LED Codes NOTE When the self test diagnostic reports a failure more information about the failure may be available inside the Test Set This additional information is output to the four LEDs on the top of the digital controller assembly The failure codes are sent out as code sequences Figure 2 6 Reading the Self Test Diagnostic The Internal LEDs on page 54 and the tables following it document some of the more useful code sequences You may need to run the Self Test Diagnostic several times to decode a particular LED sequence The LEDs output self test diagnostic codes only when the Test Set is powering up The LEDs remain off when the self test diagnostic is initiated through programming or when running the functiona
46. Set the audio analyzer s source to 1 V and set the frequencies as shown in the Performance Test Record Measure the frequency on the Test Set and compare the measured frequency to the limits 175 Performance Tests AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 The purpose of this test is to verify that the Test Set meets the specification limits in Performance Test Record table 7 17 AF Analyzer Frequency Accuracy at 400 kHz Test 17 Record on page 234 To measure frequency accuracy at 400 kHz the RF signal from the Test Set s DUPLEX OUT port is applied to the audio input and the input to the measuring receiver and the two measured frequencies are compared Setup Figure 6 22 J Measuring Receiver 885 88 8 BIEBBIOSBO 8 cy 2558 ZJ O 0008 ols en E INPUT 500 AUDIO IN High Signal Generator Procedure 1 On the signal generator a Set amplitude to 0 dBm b Set the frequency to 400 kHz 2 On the measuring receiver a Reset the instrument b Set the measurement mode to frequency 3 On the Test Set a Press Preset b Select the AF ANALYZER screen Setthe AF 1 Infieldto Audio In d Setthe Filter 2 field to 99kHz LPF 4 Measure the audio frequency on th
47. Updating Flash Calibration Files DO NOT Interrupt Power to disappear before continuing Depending on the number of calibration factors being stored this may take several minutes 129 Periodic Adjustments Calibration Running the Periodic IQ or IQ Demod Path Calibration Programs Running the Periodic IQ or IQ Demod Path Calibration Programs 1 dv SEA 482 19 Press Tests key to access the TESTS Main Menu screen see Figure 5 2 Select the field under Select Procedure Location Select ROM under the Choices menu Select the field under Select Procedure Filename Select SERVICE7 from the Choices menu Select Run Test key From the SERVICE MENU select the desired calibration program to perform Periodic Calibration for more detailed information see Periodic Calibration Menu Descriptions on page 131 IQ Calibration for more detailed information see IQ Calibration Program Description on page 137 IQ Demod Path Calibration for more detailed information see IQ Demod Path Calibration Program Description on page 139 Follow the instructions on the screen Figure 5 2 SERVICE Calibration Programs TESTS Main Menu SERVICE 2 LORD TEST PROCEDURE Select Procedure Location Help Select Procedure Filenane Library Program Description Launches diagnostic 01 SERVICE MENU CUSTOMIZE TEST PROCEDI Move pointer to the desi
48. manual procedures 70 overview 36 Receiver Synthesizer assembly I3 Reference assembly 73 RF analyzer 75 RF source 77 Signal Generator Synthesizer assembly 73 using the SERVICE screen 294 Index Index V w Value hex field SERVICE Wideband Sweep verification test screen 81 116 Variable Frequency Notch Filter adjustment 134 video output signal 50 Voltmeter Connection field SERVICE screen 79 Voltmeter References adjustment 133 VOLUME control 31 Index 305
49. 1 1990 A1 A2 EN 61010 1 1993 A2 EMC CISPR 11 1990 EN 55011 1991 Group 1 Class A 61000 3 2 1995 EN 61000 3 2 1995 EN 50082 1 1992 IEC 801 3 1984 3V m 801 4 1988 0 5 kV Sig Lines 1 kV Power Lines Supplementary Information This product herewith complies with the requirements of the Low Voltage Directive 73 23 EEC and the EMC Directive 89 336 EEC and carries the CE marking i accordingly NL Spokane Washington USA November 20 1998 Vince Roland Reliability amp Regulatory Engineering Manager European Contact Your local Agilent Technologies and Service Office or Agilent Technologies GmbH Department ZQ Standards Europe Herrenberger Strasse 130 D 71034 B blinger Germany FAX 49 703 1 14 3143 10 S agilent e8285 ALR Book chapters front fm Table 1 United States of America Agilent Technologies Test and Measurement Call Center P O Box 4026 Englewood CO 80155 4026 tel 1 800 452 4844 Canada Agilent Technologies Canada Inc 5159 Spectrum Way Mississauga Ontario L4W 5G1 tel 1 877 894 4414 Europe Agilent Technologies European Marketing Organization P O Box 999 1180 AZ Amstelveen The Netherlands tel 3120 547 9999 J apan Agilent Technologies J apan Ltd Measurement Assistance Center 9 1 Takakura Cho Hachioji Shi Tokyo 192 8510 J apan tel 81 456 56 7832 fax 81 426 56 7840 Latin America Agilent Technologies Latin America Region Hea
50. 10 700 3rd 18 000 ALL 10 800 2nd 18 000 ALL 10 800 3rd 18 000 ALL 10 900 2nd 18 000 ALL 10 900 3rd 18 000 ALL 10 1000 2nd 18 000 218 sjagilent e8285 ALR Book chapters perf_record fm Performance Test Records RF Generator Harmonics Spectral Purity Performance Test 6 Record Level RF Freq Harmonic Harmonio Limits taie Revision Number Upper Actual ALL 10 1000 3rd 18 000 ALL 10 1700 2nd 18 000 ALL 10 1700 3rd 18 000 ALL 10 1800 2nd 18 000 ALL 10 1800 3rd 18 000 ALL 10 1900 2nd 18 000 ALL 10 1900 3rd 18 000 ALL 10 2000 2nd 18 000 ALL 10 2000 3rd 18 000 ALL 11 30 2nd 18 000 ALL 11 30 3rd 18 000 ALL 11 50 2nd 18 000 ALL 11 50 3rd 18 000 ALL 11 100 2nd 18 000 ALL 11 100 314 18 000 ALL 11 200 204 18 000 ALL 11 200 3rd 18 000 ALL 11 300 2nd 18 000 ALL 11 300 3rd 18 000 ALL 11 400 2nd 18 000 ALL 11 400 314 18 000 ALL 11 500 2nd 18 000 ALL 11 500 3rd 18 000 ALL 11 600 2nd 18 000 ALL 11 600 314 18 000 ALL 11 700 204 18 000 ALL 11 700 3rd 18 000 ALL 11 800 2nd 18 000 ALL 11 800 3rd 18 000 219 Performance Test Records RF Generator Harmonics Spectral Purity Performance Test 6 Record m Level RF Freq Harmonic Revision
51. 1850 1851 2288 55 00 MX CDMA 1850 1848 7712 55 00 MX REF5 1700 1705 55 00 221 Performance Test Records RF Generator Spurious Speciral Purity Performance Test 7 Record 222 Spurious Signal Limits Spurious Source Sun q dBc Upper Actual MX REF5 1700 1695 55 00 MX REF5 1850 1855 55 00 REF5 1850 1845 55 00 S agilent e8285 ALR Book chapters perf_record fm Performance Test Records AF Generator AC Level Accuracy Performance Test 8 Record AF Generator AC Level Accuracy Performance Test 8 Record For test procedure see AF Analyzer AC Level Accuracy Performance Test 12 on page 171 Table 7 8 AF Generator AC Level Accuracy Test 8 Record ee Frequency a AC Level Limits mV Lower Upper Actual 1 25000 4000 3885 000 4115 000 1 25000 700 682 500 717 500 1 25000 75 70 000 80 000 1 10000 4000 3885 000 4115 000 1 10000 700 682 500 717 500 1 10000 75 70 000 80 000 1 1000 4000 3885 000 4115 000 1 1000 700 682 500 717 500 1 1000 75 70 000 80 000 1 100 4000 3885 000 4115 000 1 100 700 682 500 717 500 1 100 75 70 000 80 000 2 25000 4000 3885 000 4115 000 2 25000 700 682 500 717 500 2 25000 75 70 000 80 000 2 10000 4000 3885 000 4115 000 2 10000 700 682 500 717 500 2 10000 75 70 000 80 000 2 1000 4000 3885 000 4115 000 2 1000 700 682 500 717 500 2 1000 75 70 000 80 000
52. 20 HOLDDOWN_PCB 1 B i 5 88 ESEEE 7 i 86 EE UT 8 j 9 EDELE EELE FOOT BOTTOM Qty 5 COVER_BOTTOM SMM4 0_10SEMPNTX 21246 4 fe agant 447 m 88 S3agilente8285ALRWBook chapters disassembly fm Disassembly and Replaceable Parts Disassembly Procedures Top Side Assemblies 1 Removethe external and internal covers see External and Internal Covers on page 87 2 Using Figure 3 3 identify the module or board assembly you want to remove and lift the module or board assembly from the mother board Figure 3 3 Top Side Assemblies REGULATOR_ KIT DIG_CELLSITE_ KIT ANALOG C SITE_KIT DIG_CELLSITE_ KIT PROTOCOL PROC FAN ASSY DSP KIT SIGNAL SOURCE KIT CONTROLLER KIT MEMORY SRBC KI GPIB SERIAL KIT DISPLAY DRIVER KIT MOD DISTRIBUTION KIT AUDIO ANALYZER 1 KIT AUDIO ANALYZER 2 KIT MEASUREMENT KIT 5 SYNTH KIT 0 MOD KIT CDMA REF KIT RF OUTPUT KIT RECEIVER KIT HI STB REFERENCE KT DEMOD KIT RCVR SYNTH KIT SPECTRUM ANALYZER KIT 89 Disassembly and Replaceable Parts Disassembly Procedures Audio Analyzer and Filter Assemblies Figure 3 4 Audio Analyzer and Filter Assemblies AUDIO_ANALYZER_1 KIT 1 4 turn to remove or secure board Opt Description 11 CCITT_FLTR
53. 500us div 50 S agilent e8285 ALR Book chapters trouble fm Troubleshooting Self Test Diagnostics Figure 2 5 Diagnostic and Power Supply LEDs Digital Controller Board DIAG LEDs DIAG LEDs CAL MODULE DS3 ps4 DS2 m m m mDSi T Ge e e Power Supply LEDs 5 DS1 50 DS2 12STBY PD RES DS3 12V e e e e e e DS4 12A 8 o o Reading Front Panel or GPIB Codes Failure codes are listed in the table below If more than one failure occurs the failure code will be the sum of the individual failure codes The nature of the failure and the assembly most likely at fault is also listed 51 Troubleshooting Self Test Diagnostics Table 2 1 Return Values for Self Test Diagnostic Failures Returned Error Code Detected Failure Failed Assembly Hexadecimal Decimal displayed GPIB Microprocessor Digital Controller 0002 2 ROM Digital Controller 0004 4 RAM Memory SBRC 0008 8 RAM Memory SBRC 0010 16 Timer Controller 0020 32
54. AF Analyzer performance test 175 frequency references 28 front panel disassembly 99 wiring 99 Functional Diagnostics See diagnostics Functional Verification Test Record 123 fuse 49 H handles removing 87 Harmonics Spectral Purity RF Generator performance test 163 Index 301 Index 1 0 Modulator assembly 33 IBASIC controller 27 IF frequencies 255 Image Rejection Spectrum Analyzer performance test 188 internal covers top and bottom 87 IQ Calibration adjustment description 137 selecting and running 130 IQ modulation 33 302 L Latch field SERVICE screen 81 latches DAC 81 gain 81 switch 81 timebase 135 LEDs diagnostic codes 53 failure codes 48 out of lock indicators 72 power supply 49 Level Accuracy RF Analyzer performance test 179 Level Accuracy RF Generator performance test 158 LO IF Demodulation assembly 32 locating assemblies 89 M Modulation Accuracy CDMA Generator performance test 194 modulation analysis 31 Modulation Distribution assembly 33 moduleswap Seetroubleshooting assembly swap modules locating 89 Index Index operating system 28 Output assembly 33 P parts list 105 PC boards locating 89 performance test record 201 247 performance tests AC Level Accuracy AF Analyzer 171 AC Level Accuracy AF Generator 167 Amplitude Accuracy Oscilloscope 177 Amplitude Level Accuracy CDMA
55. ANTENNA IN 114 3 MH 2 oi ha MHz es Power 222 A i lt p 223 AM FM SSB Demodulation 486 1026 MHz from Receiver Synthesizer Assembly 614 3 MHz 500 MHz from Reference Assy 114 3 MHz To LO IF Demod Assembly 30 s agilent e8285 ALR Book chapters intro fm Introduction Product Description AM FM or SSB Modulation Analysis Figure 1 4 Receiver Assembly For AM FM or SSB signals the 114 3 MHz signal is downconverted to 10 7 MHz and routed through a user selected F bandpass filter 15 kHz 230 kHz that is centered around the 10 7 MHz IF AM SSB signals are demodulated at this point FM signals are downconverted to a 700 kHz IF before demodulation The demodulated signal is routed to the Audio Analyzer 1 assembly for audio frequency filtering This assembly is also connected to the front panel AUDIO IN connector for direct audio measurements Several low pass and high pass filters be selected as well as a C M essage or optional CCITT bandpass filter Frequency and voltage measurements are then made on this signal by the Measurement assembly The signal is then routed tothe Audio Analyzer 2 assembly The Audio Analyzer 2 assembly routes the signal through a user selectable detector A variable frequency notch filter may also be selected for SINAD and distortion measurements The detector s signal is then sent to several other assemblies
56. Agilent Technologies products 112 S agilent e8285 ALR Book chapters verif fm Functional Verification Process Efficiency Recommendations Process Efficiency Recommendations A Identify a test standard Golden Mobile phone for each production line This phone will be used to verify your test system and Test Set performance B Characterize components of each test system Generate baseline performance data for each Test Set Generate baseline performance data for each fixture Generate baseline normalization data for external path losses C Maintain Test System binder to include Test Set baseline data Fixture baseline data Test system normalization calibration tables Test system maintenance records Performance Verification and PTR Records Table 4 1 on page 123 D Create troubleshooting kits to include Golden mobile phone Cables and adapters Maintenance record sheets Firmware cards E Use Save Recall registers to speed up testing Chapter 4 113 NOTE Functional Verification Analog Loopback Analog Loopback Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set Analog loopback configures the Test Set to test all of its major functions A problem located in the RF and audio source or RF and audio analyzer paths will become evident
57. CDMA Generator Audio Generator RF Generator Refer ence R ator Instrument Control Input output and switch information is included to help you determine if voltages and signals are getting to the assemblies with the proper levels shapes and frequencies Line names and connector pin numbers are given on the block diagrams when applicable 250 s agilent e8285 ALR Book chapters blockdiag fm Block Diagrams Signal Flow and Interconnections Table 8 1 Block Diagrams Figure Figure 8 1 Signal Flow and Interconnections on page 252 Figure 8 2 RF 1 0 on page 254 Figure 8 3 Downconverter on page 257 Figure 8 4 Receiver Synthesizer on page 258 Figure 8 5 Receiver on page 259 Figure 8 6 Digital Cellsite 1 amp 2 on page 260 Figure 8 7 Analog Cell Site FW Rev A 04 54 and below on page 261 Figure 8 8 Analog Cell Site FW Rev A 05 03 and above on page 262 Figure 8 9 Protocol Processor on page 263 Figure 8 10 Spectrum Analyzer on page 265 Figure 8 11 Audio Analyzer 1 on page 267 Figure 8 12 Audio Analyzer 2 on page 268 Figure 8 13 Measurement Board on page 269 Figure 8 14 Signaling and Analyzer Assembly on page 270 Figure 8 15 IQ Modulator on page 272 Figure 8 16 LO I F Demodulator on page 273 Figure 8 17 Digital Signal Processor 1 DSP 1 on page 274 Figure 8
58. DUPLEX OUT Amplitude Level Accuracy Performance Test 26 13 Set the AWGN Power field to the values listed in the PTR for AWGN power See table 7 27 CDMA Generator DUPLEX OUT AWGN Power Level Accuracy Test 26 Record on page 244 14 Select the CDMA CALL CONTROL screen 15 Change the Avg Power measurement field to Chan Power Channel Power 16 Calibrate the channel power by selecting Calibrate in the Power Meas field 17 Select the CDMA GENERATOR CONTROL screen 18 Read the channel power and record it in the 193 Performance Tests CDMA Generator Modulation Accuracy Performance Test 27 CDMA Generator Modulation Accuracy Performance Test 27 The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 28 CDMA Generator Modulation Accuracy Test 27 Record on page 245 The modulation accuracy of the generator is directly measured with a vector signal analyzer at the DUPLEX OUT port Because the vector signal analyzer cannot measure rho directly the modulation accuracy is measured in EVM Error Vector Magnitude rms and rho is calculated from the EVM data Setup Figure 6 32 CDMA Generator Modulation Accuracy Test 26 ue 8 88 EES 8 8888 O oss oj6ega amp 8 Vector
59. EN ava b GOW 01 eo 5890 311195 agilent e8285 ALR Book chapters blockdiag fm 282 s Block Diagrams RF Generator Section Upconverter Figure 8 23 0661 0580 534 088 0 4 008 530 404 5481 14 3HV NMOHS QNV8 GVSY 51515345 V 5 3 02 4 SALON 98179 235 10100 01 GND 130 1n0 d iadminoa lt IOHLNO2 5531 2H8S W3H VN3 220715 viva 0268 wous 334 vs 7 OWS ANIdN qugpz ZHWOZ ANIdN 2 5 p 4 9 2 215 N3auvd 7051405 ZH5E Sl XNW 39V110 2 0002 078 ino wodn zr 2 0681 004 o ZHWOOOL 008 ZHWOOOL gt YaLYSANOIdN NOILISS 104100 NI AN2dn 283 Block Diagrams Reference Regulator Section Reference Regulator Section Reference All frequencies are derived from a 10 MHz reference which can come from an external reference from a 10 MHz crystal oscillator on the Reference assembly figure 8 24 on page 285 The High Stability Reference assembly develops the local oscillator LO and reference signals needed by the assemblies that make up the RF generator RF analyzer spectrum analyzer and the Measurement assembly Power Supply Regulator Power supply regulators figure 8 25 on page 286 are distributed to a
60. Generator PCMCIA Program Yes RF Input Output Level Accuracy System Power 6380 61811 Digital Cellsite 1 amp 2 Functional Diagnostics SERVICE7 Yes CDMA Loopback IQ Modulator Upconverter RF Diagnostics Upconverter Yes RPG Assembly No Front Panel No Receive DSP Functional Diagnostics CDMA No Loopback PCMCIA No Signaling Source Analyzer AF Diagnostics Audio No Frequency Generators 1 and 2 Controller Functional Diagnostics Self Test No Memory SBRC Functional Diagnostics Self Test No Downconverter RF Diagnostics Downconverter Yes Power Supply Regulator Functional Diagnostics Self Test No Fans No 70 S agilent e8285 ALR Book chapters trouble fm Troubleshooting Manual Troubleshooting Procedures SERVICE7 Program Diagnostic Performance iodi i ion Cal Data Assembly Name Test 5 Calibration 22 Sub Test est to Perform rogram eede Display Drive Functional Diagnostics Self Test No Power Functional Diagnostics Self Test No Supply Signal RF Diagnostics RF Generator Harmonic and Yes Generator Signal Generator Synthesizer Spurious Spectral Purity Synthesizer LO IF IQ Modulator CDMA Diagnostics LO_IF IQ SERVICE7 Yes Mod IQ Modulator RF Output RF Diagnostics Output Yes Reference RF Diagnostics Reference RF Generator Residual FM Yes Receiver RF Diagnostics Receiver RF Analyzer Residual FM Yes Synthesizer Synthesizer CDMA Generator
61. IN High Procedure 1 On the Test Set a Press Preset b Select the RF GENERATOR screen Set AFGen1 and AFGen2 To fields to Audio Out d Set AFGen1 To level field 01 00 V and 1 Freq field to 1 kHz e Setthe AFGen2 To level field to 100 mv and AFGen2 Freq field to 2 kHz 2 For the frequency the harmonic and level settings of Audio Frequency Generator 2 shown in the Performance Test Record measure the distortion and SINAD on the Test Set and compare the measured values to the limits 173 Performance Tests AF Analyzer DC Level Accuracy Performance Test 15 AF Analyzer DC Level Accuracy Performance Test 15 The purpose of this test is to verify that the Test Set meets the specification limits in Performance Test Record table 7 15 AF Analyzer DC Level Accuracy Test 15 Record on page 232 To measure DC level accuracy a DC signal is measured by an external digital multimeter and compared to the Test Set s internal DC voltmeter reading Setup Figure 6 20 Multimeter B eoo INPUT m LLLI 55 6 6 AUDIO OUT AUDIO IN High Procedure 1 Set the multimeter to measure DC volts 2 On the Test Set Press Preset Select the AF ANALYZER screen Set the AF Anl In field to Audio In Set the lower right measu
62. In this configuration the RF and audio generators will be used to simulate a low level modulated transmitter signal The RF receiver will be used to demodulate this signal and pass it on to the audio analyzer to make the SINAD measurement 1 2 Press the green Preset key to configure instrument to default settings Connect a short RF cable between the DUPLEX OUT port and the ANTENNA IN port Configure the instrument for loopback mode 3a Press the Config key and set the following fields RF Display Freq RF Offset On Gen Anl 0 MHz 3b Press the AF analyzer key and set the following fields Speaker ALC ON Speaker Vol POT 3c Press the Duplex key and set the following fields Tune Freq 501 MHz FW rev A 02 XX and below 900 MHz FW rev A 04 5X and above Input Port Ant RF Gen Freq 501 MHz FW rev A 02 XX and below 900 MHz FW rev A 04 5X and above Amplitude 80 dBm Output Port Dupl AFGenl To FM 3 10 kHz AF Anl In FM Demod Filter 1 300 HPF Filter 2 3 kHz LPF De Emphasis OFF Detector RMS SQRT2 114 S agilent e8285 ALR Book chapters verif fm Functional Verification Analog Loopback 4 Turn up the VOLUME knob to hear the 1 kHz tone 5 SINAD meter should read gt 35 dB 6 Change the Amplitude setting to 100 dBm the SINAD meter should read gt 12 dB 7 Record results in Table 4 1 on page 123 SUGGESTION Store instrument settings as a Save R
63. Lebanon Libya Lithuania Luxembourg Macedonia Madeira Islands Malagasy Republic Mali Malta Mauritania Miquelon Moldova Mongolia Morocco Mozambique Nepal Netherlands Netherlands Antilles Niger Norway Oman Pakistan Paraguay Poland Portugal Rep South Africa Romania Russia Rwanda Saudi Arabia 220V Senegal Slovak Republic Slovenia Somalia Spain Spanish Africa Sri Lanka St Pierce Islands 13 Plug Descriptions Plug type male female Agilent Part cable amp plug Cable Descriptions Sweden Syria Tajikistan Thailand Togo Tunisa Turkey Turkmenistan USSR Ukraine Uzbekistan Western Africa Western Sahara Yugoslavia Zaire Table 4 Plug Descriptions Plug Type male female Agilent Part cable amp plug Cable Descriptions Straight Straight Straight 90 8120 0698 90 inches black Used in the following locations Peru Table 5 Plug Descriptions Agilent Part e Plug Type 4 cable amp plug Cable Descriptions Straight Straight 8120 2104 79 inches gray Straight 90 8120 2296 79 inches gray Used in the following locations Switzerland 14 S agilent e8285 ALR Book chapters front fm Table 6 Plug Descriptions Agilent Part Plug Type cable amp plug Cable Descriptions Straight
64. Return Values for Self Test Diagnostic Failures on page 52 are weighted by the binary value The weighted value for this example is decimal 27 128 or hexadecimal 80 This failure is easy to simulate simply power up the Test Set while holding down a key 53 Troubleshooting Self Test Diagnostics Figure 2 6 Reading the Self Test Diagnostic The Internal LEDs 1 Remove the Test Set s external cover 2 Turn power on 3 Read the LED sequence on the digital LED Legend controller board see below and compare with e off the patterns below 06 rapid blink NOTE Xt steady on or slow blink For multiple failures the failure patterns described below will repeat for all failures detected LED Sequences No Failures Failures three patterns are displayed The LEDs will light The first blinks rapidly gg The second and third patterns for approximately 10 and indicates the type of blink slowly and indicate seconds then all will failure failure details turn off 0 1 2 3 0 1 2 30 1 2 3 e x xt Xt e e e See the following tables This example indicates a This example indicates faulty Audio Analyzer 1 a Serial Bus assembly Communication problem Digital Controller Board CAL MODULE 54 S agilent e8285 ALR Book chapters trouble fm Troubleshooting Self Test Diagnostics
65. Straight 8120 1378 90 inches jade gray 125V Straight 90 8120 1521 90 inches jade gray Straight Straight 8120 1751 90 inches jade gray Used in the following locations American Samoa Bahamas Barbados Belize Bermuda Brazil Caicos Cambodia Canada Cayman Islands Columbia Costa Rica Cuba Dominican Republic Ecuador Salvador French West Indies Guam Guatemala Guyana Haiti Honduras J amaica Korea Laos Leeward and Windward Islands Liberia Mexico Midway Islands Nicaragua Other Pacific Islands Panama Philippines Puerto Rico Saudi Arabia 115V 127V Suriname Taiwan Tobago Trinidad Trust Territories of Pacific Islands Turks Island United States Venezuela Vietnam Virgin Islands of the U S Wake Island 15 Table 7 Plug Type Plug Descriptions male female Agilent Part cable amp plug Cable Descriptions JIS C 8303 100 V Straight Straight Straight 90 8120 4753 8120 4754 90 inches dark gray 90 inches dark gray Used in the following locations J apan Table 8 Plug Descriptions Agilent Part or Plug Type cable amp plug Cable Descriptions 90 Straight 8120 2956 79 inches gray 90 90 8120 2957 79 inches gray 8120 3997 79 inches gray Straight Straight Used in the following locations
66. The Digital Cellsite assembly see figure 8 6 on page 260 generates or buffers external data that emulates a CDMA traffic channel and outputs this data to the CDMA Reference see figure 8 18 on page 276 The CDMA Reference assembly converts the data into and Q drive signals and sends it back to the Digital Cellsite assembly to be summed with calibrated noise sources The signals are then passed to the IQ Modulator figure 8 15 on page 272 for modulation with RF CDMA Reference TheCDMA Reference supplies all the CDMA docks for the Receive DSP and the Digital Cellsite assemblies The CDMA Reference also provides reference switching for an external or the internal reference source 275 Block Diagrams CDMA Generator Section CDMA Reference Figure 8 18 JYES WAW 01 SVAW OL au 3SIONO 3ounos NDMV Tvld3S 4 0 1 OL 4 3SIONI oOgWASXS 3N du NI 2NAS 90 TU ee ee 33S N3 3 7102011054 353009 5316 1182 DOWNY 8 TWLIDIG 450 140 450 OL 2450 01 254 25 go ZHW 809961 M S32N3H3d3H 1V LIDIG v 0850 OL 154 3 01 53157130 8 DOTVNV OL 2 8 iu cdam 53 1VLISIG OL 2 9 I ZHW 8099 61 N LN 34 0268 ZHW Ob 01 gt ZHW 0 5 07 OL ZHW 0 32N3H3H3M 276 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams Aud
67. ZFL 2000 Amplifier 1 5 or equivalent GIC RF Products GRF Amplifier 2 27 28 5016 or equivalent 3458A Multimeter 8 9 12 15 18 5316A Counter 11 16 8562 Spectrum Analyzer 6 7 8663A Signal Generator High Performance 4 20 23 28 8648B Option LEA Signal Generator 19 8902A Measuring Receiver 1 5 17 19 22 25 27 8903B Audio Analyzer 4 10 12 16 18 20 22 11667A Power Splitter 19 27 28 11722A Sensor Module 5 19 25 27 11793A Microwave Converter 1 5 E4420B Signal Generator 1 5 24 27 E6380 61811 System Power Calibration Program Software Kit 19 89441A with options Vector Signal Analyzer 26 AYA AY9 UFG EPM 438 Power Meter 25 28 8482A Power Sensor 25 28 a Required amplifier specifications are frequency range 1 7 to 2 0 GHz gain gt 18 dB noise figure 5 dB For more information about Mini Circuits contact them at 718 934 4500 or http www minicircuits com b Required amplifier specifications are frequency range 1 0 to 2 0 GHz gain of 43 dB out put power of 20 dBm For more information about GIC contact them at 310 673 8422 or GIC primenet com c To order the System Power Calibration Card see Ordering Replacement Parts and Sup port on page 85 143 Performance Tests Procedure and Equipment Table 6 2 Performance Tests amp Records Location Test Record in Perf
68. _ og O 90000 0000 80000 02990 0000 Eo INPDT509 DUPLEX OUT Microwave Converter Signal Generator RF INPUT IF OUTPUT LO INPUT RF OUTPUT 149 Performance Tests RF Generator FM Accuracy Performance Test 2 Procedure NOTE 150 Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set Steps 1 2 and 3 in the following procedure apply to both of the setups shown in figure 6 3 and figure 6 4 on page 149 1 On the measuring receiver P Reset the instrument Set the high pass filter to 300 Hz Set the low pass filter to 3 kHz Set the measurement mode to FM Set the FM de emphasis off If the microwave converter is being used set the frequency offset mode to exit the mode 27 0 Special 2 On the Test Set h i Press Preset Select the CONFIGURE screen Set the RF Display field to Freq Set the RF Offset to Off Set the Output Port field to Dup1 Select the RF GENERATOR screen Set the RF Gen Freq field to the appropriate RF frequency based on the firmware revision see NOTE above from the Performance Test Record Set the Amplitude to 10 dBm Set the 1 To field to FMat 99 kHz deviation 3 F
69. be displayed if invalid frequencies are set TheRF Output assembly performs three tasks Mixes or divides the 500 to 1000 MHz signal to produce signals below 500 MHz down to 30 MHz A 1 GHz LO from the Reference assembly is used for mixing Provides AM modulation when selected Controls the signal level out of the assembly using an Automatic Level Control AL C loop The signal from the RF Output assembly is sent to one of two paths the U pconverter assembly RF frequencies from 30 MHz to 1 GHz route through the bypass path PCS frequencies are upconverted to supply frequencies from 1700 to 2000 MHz The user selected frequency contains desired modulation AM FM or CDMA or a continuous wave CW signal The level has been adjusted to provide the required level after going through RF 1 0 assembly 33 Introduction Product Description RF and Duplex Outputs NOTE Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set The RF 1 0 assembly receives the signal from the U pconverter assembly and routes it to the selected output connector RF IN OUT or DUPLEX OUT The signal first goes to a variable attenuator for level control If the DUPLEX OUT connector is selected the signal then goes directly to that connector without additional atte
70. e8285 ALR Book chapters intro fm Introduction Product Description RF Signal Generation The Signal Generator Synthesizer assembly creates a 500 to 1000 MHz signal The reference signal for the synthesizer is supplied by the High Stability Reference assembly The synthesizer s frequency is varied using a divider network in the feedback circuit of the phase locked loop Any FM modulation signal from the Modulation Distribution assembly and the frequency sweep signal for the spectrum analyzer and tracking generator are integrated into this feedback loop If a CDMA signal is not being generated the 500 1000 MHz signal is passed through the 1 9 Modulator assembly bypassing the 1 0 modulator 1Q Modulation If a CDMA signal is being generated the signal is 1 0 modulated the 1 Q Modulator assembly using data from the Analog Cellsite assembly TheAnalog Cellsite assembly gets its data from the two Digital Cellsite assemblies which are controlled by the Protocol Processor assembly Up to eight code channels of CDMA modulation data and noise may be summed into the IQ modulator at one time These channels provide phone paging synchronization voice traffic transmission and other CDMA system functions Final Frequency Conversion and Leveling NOTE Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will
71. figure 8 23 on page 283 develops the RF generator s 1 7 to 2 0 GHz range by mixing the 800 1000 MHz signal from the output section with a 1 5 3 0 GHz LO Output Frequency Derivation 30 MHz 250 MHz mix 250 MHz 500 MHz divide 500 MHz 1 GHz pass 1 7 GHz 2 0 GHz mix Level Control The RF Output Section assembly figure 8 22 on page 282 has an automatic level control AL C loop that acts as a vernier control of RF level between 2 and 9 dBm A step attenuator in the RF 1 assembly figure 8 2 on page 254 takes the level down to 127 dBm 137 dBm at the RF IN OUT connector in 5 dB steps Assemblies that affect output level calibration have factory generated calibration data stored the Test Set s EEPROM Calibration data is fed to digital to analog converters which control level adjustable devices in the RF path These assemblies are RF I O 279 Block Diagrams RF Generator Section RF Output Section Modulation Amplitude modulation AM is done on the RF Output Section assembly figure 8 22 on page 282 The modulating signal from the Modulation Distribution assembly is applied to the ALC loop s control voltage IQ modulation is done on the IQ Modulator assembly figure 8 15 on page 272 Digital Cellsite is modulated onto the RF signal from the Signal Generator Synthesizer assembly figure 8 21 on page 281 280 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams
72. listed in table 1 1 Becausethis calibration program is written specifically for this equipment no substitutions are possible Table 1 1 Equipment List for System Power Calibration Program Equipment Type Agilent Technologies Model Number Signal Generator 8648B Option 1EA Power Meter 436A 437B 438A EPM 441A EPM 442A 8901B 8902A Power Sensor 8482A ECP E18A 11722A Power Splitter 11667A GPIB Cables 2 cables required 3 if GPIB printer is used Any GPIB cable Printer optional Any serial parallel or GPIB printer 40 S agilent e8285 ALR Book chapters intro fm Introduction E8285A Support Contacts 8285A Support Contacts The documentation supplied with your Test Set is an excellent source of reference applications and service information Please use these manuals if you are experiencing technical problems Application information is located in the E8285 Application Guide p n E8285 90019 and the GPIB Condensed Programming Reference Guide p n 8285 90020 Operation and reference information are included the E8285A CDMA Mobile Station Test Set User s Guide p n E 8285 90018 Calibration and repair information in this manual If you have used the manuals and still have application questions contact your local representative Repair assistance is available from the factory by phone and email Internal Agilent Technologies user
73. new measured level at 83 dBm h Continue measuring the level down to 116 dBm Move the input to the RF IN OUT port without the amplifier inserted Measure and record the RF level at the levels down to and including 83 dBm shown in the PTR at the Test Set s RF IN OUT port After recording the reading at 83 dBm insert an RF amplifier into the output of the Test Set Record the new measured level at 83 dBm Continue measuring the level down to 116 dBm Correct the measured reading for each level measured without the amplifier as follows Add the RF power measured in step 3c or 5b to the measured level For example if the level in step 3c is 10 2 dBm and the level at 55 dBm is 45 1 dB record a level of 10 2 45 1 55 3 dBm Compare the corrected values with the limits in the PTR Correct the measured reading for each level measured with the amplifier by summing the following values RF power measured at 11 dBm in step 3c or 5b RF level measured at 83 dBm in step 71 RF level measured at 83 dBm in step 7j RF level measured in step 7k 161 Performance Tests RF Generator Level Accuracy Performance Test 5 For example if RF power measured at 11 dBm in step or 5b 10 2 dBm RF level measured at 83 dBm in step 7i 70 1 dB RF level measured at 83 dBm in step 7j 52 6 dB RF level measured at 101 dBm in step 7k 73 2 dB the corrected level at 10
74. on a continuous basis If an assembly is replaced it is recommended that the firmware be upgraded at the same time This is important if an assembl y level repair is performed because exchange assemblies which may be of a later revision than the one being replaced may require a later revision of the firmware to function correctly 42 S agilent e8285 ALR Book chapters intro fm Introduction Ordering New Manuals Ordering New Manuals The Test Set is designed to allow future upgrades to hardware and firmware which may obsolete some of the material in this manual For the latest document revisions and information call the Direct Parts Ordering office U S only 1 800 227 8164 For local and remote operating information including descriptions of all controls connectors and programming syntax refer to the E8285 User s Guide part number 8285 90018 For application information refer to the E8285 Application Guide p n 8285 90019 Also all manuals are available on CD ROM p n E 8285 10003 43 44 s agilent e8285 ALR Book chapters intro fm Troubleshooting This chapter explains how to isolate a problem to the defective assembly Troubleshooting uses the Test Set s built in diagnostics If diagnostics can t identify the faulty assembly supplementary information in the form of manual troubleshooting procedures is provided 45 Troubleshooting How to Troubleshoot the Test Set How to Troubleshoo
75. panel ANTENNA IN connector which is input at the frequency that is keyed in from the front panel keypad If an external 10 MHz reference is being used it must be disconnected In order for the calibration to be valid the signal applied to the ANTENNA IN connector must have the following characteristics 1 The level should be between 30 and 20 dBm 0 001 and 100 mW 2 The frequency should be between 800 and 1000 MHz 3 The frequency must be as accurate as the application of the Test Set requires 4 The Test Set must be able to tune to within 10 or 100 kHz of the reference signal with the Test Set s current timebase reference settings If this condition is not met either the keyed in frequency is incorrect or the Test Set is faulty 5 The signal must be a CW signal Specifically any FM must be less than 100 Hz peak as measured by the Test Set 6 The coarse tune DAC must be between 3 and 250 decimal otherwise the frequency of the source is out of reach by the tuning DAC After the coarse and fine tune DAC settings have been determined the values are downloaded into the Test Set s memory 132 siagilent es285 ALR Book chapters period_adj fm Periodic Adjustments Calibration Periodic Calibration Menu Descriptions Voltmeter References When you select the Voltmeter Reference calibration instructions are displayed explaining how to measure the negative and positive references with an external voltmeter The user is r
76. parts in this product Refer servicing to qualified personnel To prevent electrical shock do not remove covers Servicing instructions are for use by qualified personnel only To avoid electrical shock do not perform any servicing unless you are qualified to do so The opening of covers or removal of parts is likely to expose dangerous voltages Disconnect the product from all voltage sources while it is being opened Adjustments described in the manual are performed with power supplied to the instrument while protective covers are removed Energy available at many points may if contacted result in personal injury The power cord is connected to internal capacitors that my remain live for 5 seconds after disconnecting the plug from its power supply For Continued protection against fire hazard replace the line fuse s only with 250 V fuse s or the same current rating and type for example normal blow or time delay Do not use repaired fuses or short circuited fuseholders CAUTION Always use the three prong ac power cord supplied with this product Failure to ensure adequate earth grounding by not using this cord may cause product damage This product is designed for use in Installation Category and Pollution Degree 2 per IEC 1010 and I EC 664 respectively For indoor use onl y This product has autoranging line voltage input be surethe supply voltage is within the specified range Ventilation Requirements When i
77. periodic adjustment procedures for the Test Set 125 Periodic Adjustments Calibration Periodic Adjustments Periodic Adjustments NOTE Some assemblies or combinations of assemblies require periodic adjustments to compensate for variations in circuit performance due to age or environment There are two types of calibration data Factory generated digital data either on memory cards or on board ROMs which are on the assemblies themselves Data generated internally by running calibration programs ROM based or external System Power Calibration Program on page 39 In either case calibration data is loaded into non volatile memory on the controller assembly Because calibration data resides on the Controller assembly it is important that whenever this assembly is replaced that the data be transferred from the original assembly to the new one The calibration data resides on a CAL MODULE daughter board which can be moved with little danger of losing its contents Insure that the serial number of the daughter board matches the serial number of the Test Set Refer to the instructions accompanying the replacement assembly for details To download calibration data supplied on a memory card follow the instructions that come with the replacement assembly To create and download calibration data for assemblies requiring a periodic adjustment follow the steps later in this chapter For a summary of assemblies and their ca
78. reference signal from the CDMA Generator Reference assembly 72 S agilent e8285 ALR Book chapters trouble fm Troubleshooting Manual Troubleshooting Procedures If the 10 MHz signal is not present at all then the CDMA Generator Reference assembly is faulty If the signal is present on pin 20 but not pin 19 then the Motherboard assembly is faulty open or short Reference Verification 1 Turn the Test Set off and re install the Reference assembly 2 Remove the Receiver Synthesizer assembly 3 Turn the Test Set on and verify that a 1 MHz signal of approximately 1 dBm is present on pin 3 of J21 This is the reference signal from the Reference assembly 4 If the 1 MHz signal is not present then the Reference assembly is probably faulty It is also possible that an open or shorted trace on the motherboard assembly exists Check the motherboard for continuity between J21 pin 3 under the Receiver Synthesizer assembly and J18 pin 2 under the Reference assembly and verify that the trace is not shorted to ground Receiver Synthesizer Unlocked If the 1 MHz signal is present on pin 3 of J21 then the Receiver Synthesizer assembly is faulty Signal Generator Synthesizer Unlocked 1 Turn the Test Set off and remove the Signal Generator Synthesizer assembly 2 If the signal is present then the Signal Generator Synthesizer assembly 18 faulty 3 Turn the Test Set and verify that a 1 MHz signal of about 20 dBm is pres
79. repair the Test Set yourself or send it to your local Agilent Technologies Instrument Support Center Before starting a repair you should become familiar with basic Test Set operation using the user s guide Troubleshooting relies on built in diagnostics Because some diagnostic results may be ambiguous further interpretation and testing may be required There are several diagnostic routines built into the Test Set Power up self test diagnostics to test controller functioning These are automatically run when the instrument is turned on and can also be run after the instrument has been on RF Radio Frequency assembly diagnostics AF Audio Frequency assembly diagnostics Digital assembly diagnostics for CDMA signals Troubleshooting hints in this manual include Instructions on how to begin troubleshooting see chapter 2 Troubleshooti ng Block diagrams and theory of operation this chapter and chapter 8 Block Diagrams Detailed information about the built in diagnostics see chapter 2 Troubleshooti ng Error message explanations see chapter 10 Error Messages 36 S agilente8285 ALR Book chapters intro fm Introduction Repair Process Repair Process Repairing the Test Set consists of Identifying the faulty assembly see chapter 2 Troubleshooting Ordering a replacement assembly see chapter 3 Disassembly and Replaceable Parts Replacing the faulty assembly see cha
80. the pointer to the desired test using the AMEN knob then press the knob Press Menu to 30 to the Service Menus Exit to abort gt All Audio Tests Audio Freauency Generators 1 and 2 Edit Diagnostic Linits Preliminary Audio Paths Periodic Calibration Hi BAB Hod Distribution External Paths IQ Denod Path Calibration Audio Analyzer 1 Internal Paths Audio Analyzer 1 External Paths Audio Analyzer 2 Functional Diagnostics AF Diagnostics RF Diagnostics COMA Diagnostics Help 5 CDMA Diagnostics TESTS IBRSIC Controller RF Diagnostics Move the pointer to the desired test using the TESTS IBRSIC Controller knob then press the knob Press Menu 2 I Run at room temperature after 15 minute warmup Move the pointer to the desired test using the gt All COMA Tests a knob then press the knob Press Service Menu 2 COMA Reference Test to 30 to the Service Menus Exit to abort Analog Cell Site Test Run at room temperature after 15 minute 19 Modulator Test LOVIF Demodulator Test Serv Menu All RF Tests Ed Reference Run the Functionals RFs and Audio Freauency Synthesizer Diagnostics first Exit ___ Output Upconverter RF Input Output Down Converter Spectrum Analyzer sss Receiver 61 Troubleshooting Functional Diagnostics Functional Diagnostics Menu NOTE
81. to modify Test Set operation Access to these functions under manual control is provided to allow further troubleshooting when the diagnostics cannot isolate a failure to a specific assembly To do this you must understand how to operate the Test Set and especially understand how the assemblies in the Test Set work together Detailed manual Test Set operation is provided in the Agilent Technologies E8285A User s Guide Refer to Chapter 8 Block Diagrams on page 249 for information on how the overall instrument and each module work How to Access the SERVICE Screen 1 Press Preset key 2 Press the Config key on the Test Set to access the CONFIGURE screen see Figure 9 1 on page 295 3 Select the SERVICE field in bottom right corner of the screen Field Names and Descriptions Voltmeter Connection This field see Figure 9 1 selects the desired circuit node for voltage measurements To change the voltmeter connection move the cursor in front of the Voltmeter Connection field and push the cursor control knob A Choices menu will appear Move the cursor tothe desired circuit node in the list and push the cursor control knob The reading is displayed in the voltage measurement field at the top left of the display Because the diagnostic MU X points being measured must bein the range of 0 to 25 volts the measurement of some points are scaled to that measurement range For example the 12 Volt reference MEAS 12 REF should me
82. 0 125 1 100 4000 0 125 1 100 2000 0 125 1 100 200 0 125 2 25000 4000 0 125 2 25000 2000 0 125 2 25000 200 0 125 2 10000 4000 0 125 2 10000 2000 0 125 2 10000 200 0 125 2 1000 4000 0 125 2 1000 2000 0 125 2 1000 200 0 125 226 siagilent e8285 ALR Book chapters perf_record fm Performance Test Records AF Generator Residual Distortion Performance Test 10 Record Distortion Limits Frequency Level AF Generator Hz mV Upper Actual 2 100 4000 0 125 2 100 2000 0 125 2 100 200 0 125 227 Performance Test Records AF Generator Frequency Accuracy Performance Test 11 Record AF Generator Frequency Accuracy Performance Test 11 Record For test procedure see AF Generator Frequency Accuracy Performance Test 11 on page 170 Table 7 11 AF Generator Frequency Accuracy Test 11 Record 10 Frequency Frequency Limits Hz Lower Upper Actual 1 25000 24993 750 25006 250 1 10000 9997 500 10002 500 1 5000 4998 750 500 125 1 2000 1999 500 2000 500 1 1000 999 750 1000 250 1 500 499 875 500 125 1 200 199 950 200 050 1 100 99 975 100 025 1 50 49 988 50 012 1 20 19 995 20 005 2 25000 24993 750 25006 250 2 10000 9997 500 10002 500 2 5000 4998 750 500 125 2 2000 1999 500 2000 500 2 1000 999 750 1000 250 2 500 499 875 500 125 2 200 199 950 200 050 2 100 99 975 100 025 2 50 49 988 50 012 2 20 19 995 20 005
83. 000 99 1 95 035 102 965 ALL 2000 50 1 47 750 52 25 ALL 2000 3 1 2 845 3 155 205 Performance Test Records RF Generator FM Flatness Performance Test 3 Record RF Generator FM Flatness Performance Test 3 Record For test procedure see RF Generator FM Flatness Performance Test 3 on page 152 Table 7 3 RF Generator FM Flatness Test 3 Record Computed FM Measured Computed dee ae aaa d 1 Revision KHz Lower Upper Reading Computed lt A 02 XX 10 521 50 1 Reference 0 dB lt A 02 XX 10 521 50 0 1 1 1 lt A 02 XX 10 521 50 0 2 1 1 lt 02 10 521 50 2 1 1 lt 02 10 521 50 10 1 1 lt 02 10 521 50 25 1 1 ALL 10 975 5 50 Reference 0 dB ALL 10 975 5 50 0 1 1 1 ALL 10 975 5 50 0 2 1 1 ALL 10 975 5 50 2 1 1 ALL 10 975 5 50 10 1 1 ALL 10 975 5 50 25 1 1 The following entries for 2 GHz setup ALL 10 1700 50 Reference 0 dB ALL 10 1700 50 0 1 1 1 ALL 10 1700 50 0 2 1 1 ALL 10 1700 50 2 1 1 ALL 10 1700 50 10 1 1 ALL 10 1700 50 25 1 1 ALL 10 2000 50 Reference 0 dB ALL 10 2000 50 0 1 1 1 206 S agilent e8285 ALR Book chapters perf_record fm Performance Test Records RF Generator FM Flatness Performance Test 3 Record Computed FM Measured Computed E nu Level RF Deviation eis Limits 2 2
84. 1 dBm is 10 2 70 1 52 6 73 2 100 9 dBm Compare the corrected values with the limits in the PTR 162 S agilent e8285 ALR Book chapters perf_test fm Performance Tests RF Generator Harmonics Spectral Purity Performance Test 6 RF Generator Harmonics Spectral Purity Performance Test 6 Setup Figure 6 11 Procedure NOTE Spectrum Analyzer 88 888 The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 6 RF Generator Harmonics Spectral Purity Test 6 Record on page 218 Harmonic signals with the carrier set to several frequencies and two different levels maximum output and minimum level vernier are searched for by an RF spectrum analyzer INPUT S00 DUPLEX OUT Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set 1 Set up the spectrum analyzer in accordance with its operating manual 2 On the Test Set Press Preset Select the CONFIGURE screen Set the RF Display field to Freq Set the RF Offset to Off eo Set the Output Port field to Select the RF GENERNATOR screen g Setthe RF Gen Freq field to the appropriate RF freq
85. 18 CDMA Reference on page 276 Figure 8 19 Signaling and Analyzer Assembly on page 277 Figure 8 20 Modulation Distribution on page 278 Figure 8 21 Signal Generator Synthesizer on page 281 Figure 8 22 RF Output Section on page 282 Figure 8 23 U pconverter on page 283 Figure 8 24 High Stability Reference on page 285 Figure 8 25 Regulator on page 286 Figure 8 26 Memory SBRC on page 288 Figure 8 27 Controller on page 289 Figure 8 28 Display Driver on page 290 Figure 8 29 GPIB Serial page 291 251 wy Beipyoo q ssa deyo yoog y 1 16828914916 5 DUPLEX ANTENNA RF IN OUT AUDIO OUT AUDIO IN no Q VOL ON OFF FRONT PANEL 10 MHz OUT CDMA CLOCK MUX OUT 19 6608 MHz OUT REF IN MONITOR OUT MOD IN DOWN SPECTRUM RF I O lcoNvERTER RECEIVER m LO IF DEMOD ANALYZER PROTO TRIG1 E EXT MEAS TRIG IN id y pest TRIGO RCVR DMA pra DCS1 065
86. 2 CA AY RBN 26 CND E8285 61057 CA CX BNC DSUB 2 E 8285 61066 CBL_AY_LNE_MDL 8285 61047 CBL_AY_VOL_CONT E8285 61043 CCITT FLTR 4011 08920 61055 CDMA LO IF DEMOD KIT 08924 61805 CDMA REF KIT E8285 61804 CHASSIS AY E8285 61001 CHASSIS AY BOT E8285 61035 COAXIAL_SWITCH 33314 60015 CONDENSE_REF_GDE E8285 90020 CONN_SCREWLOCK_F 0380 2079 CONTROLLER_ KIT E 8285 61808 105 Disassembly and Replaceable Parts Description Part Number CORE SHIELD BEAD E8285 61058 COVER BOTTOM E8285 00012 COVER_EXTERNAL E8285 00070 CX_A06A06 120 8120 5846 CX_F_BNC SMB E 8285 61018 CX_F_SMB SMB_170 E8285 61049 CX_F_SMB SMB_530 E 8285 61051 DIG_CELLSITE_ KIT E 8285 61832 DIGITAL_CVR_AY E8285 61009 DISPLAY_ KIT E 8285 61823 DISPLAY_DRIVER_KIT 6380 61816 DNCONV KIT FW Rev A 02 XX and below 6380 61808 DNCONV FW Rev A 04 5X and above E 8285 61861 DSP_ KIT E 8285 61812 FAN_ ASSY 8285 61014 FOOT BOTTOM E5515 40010 FRONT FRAME ASSY E 8285 61822 FUSE_5A_250V 2110 0882 FW_UPGRAD KIT E 8285 61815 GRD_BRKT_SMB E8285 00029 GRND_SPRING SMA E8285 00065 GROUND_BRKT_CBL E 8285 00048 HEAT_SINK_PWR_SUP E8285 00040 HI STB REFERENCE KT 08920 618
87. 2 PROTOCOL DCS TRIG UP REF DCS1 TRIG2 t PSO2 TRIG OUT CONVERTER 1 DSP TRIG IN SIGGEN 8920 t 5 3 PMF DSP2 SYNTH BEEN REF DOS1 SERA B Possible 0652 SER Futue NOISE Enhancements 21 MOD L ERE OUTPUT IQ MOD HOST SER 1 1 HOST SER 2 AUDIO IN FP pe OUT GPIB SIGNALING SOURCE amp moo a ANALYZER m AUDIO 1 AUDIO 2 MEAS 1 PARALLEL 1 Y Y MEM 17 SBRC GPIB PARALLEL 1 HOST SER 1 1 HOST SER 2 KYBD DISPLAY GPIB LINE POWER PCMCIA DRIVE SERIAL SUPPLY REGULATOR 1 Y DISPLAY COMPOSITE VIDEO EVEN SEC SYNC IN SA TRIG REAR PANEL T 8 14 Suomn euuo2J93u Mo jJeubis suonoeuuooJeju pue jeufiis sueJfeiq 32018 Block Diagrams RF Input Output Section RF Input Output Section RF Power Measurement An RF power measurement can only be made by supplying a signal to the RF IN OUT port of the Test Set See Figure 8 2 RF 1 0 on page 254 A power splitter then splits the signal between an RF analysis path and a power measurement path The power detector has a direct path to the Receive DSP where average power measurements are made There s also a diode peak detector to provide a peak power measurement through the M easurement assembl y Accuracy is insu
88. 22 ALL DUPLEX OUT 2000 28 29 27 ALL DUPLEX OUT 2000 33 34 32 ALL DUPLEX OUT 2000 38 39 37 ALL DUPLEX OUT 2000 43 44 42 ALL DUPLEX OUT 2000 48 49 7 ALL DUPLEX OUT 2000 53 54 52 ALL DUPLEX OUT 2000 58 59 57 ALL DUPLEX OUT 2000 63 64 62 ALL DUPLEX OUT 2000 68 69 67 ALL DUPLEX OUT 2000 73 74 72 ALL DUPLEX OUT 2000 78 79 77 ALL DUPLEX OUT 2000 83 84 82 ALL DUPLEX OUT 2000 88 89 87 ALL DUPLEX OUT 2000 93 94 92 ALL DUPLEX OUT 2000 98 99 97 ALL DUPLEX OUT 2000 103 104 102 ALL DUPLEX OUT 2000 108 109 107 ALL DUPLEX OUT 2000 113 114 112 ALL DUPLEX OUT 2000 118 119 117 ALL RF IN OUT 2000 23 24 25 21 75 ALL RF IN OUT 2000 28 29 25 26 75 ALL RF IN OUT 2000 33 34 25 31 75 ALL RF IN OUT 2000 38 39 25 36 75 ALL RF IN OUT 2000 43 44 25 41 75 216 sjagilent e8285 ALR Book chapters perf_record fm Performance Test Records RF Generator Level Accuracy Performance Test 5 Record 4 RF Level Level Limits dBm Revision Lower Upper Actual ALL RF IN OUT 2000 48 49 25 46 75 ALL RF IN OUT 2000 53 54 25 51 75 ALL RF IN OUT 2000 58 59 25 56 75 ALL RF IN OUT 2000 63 64 25 61 75 ALL RF IN OUT 2000 68 69 25 66 75 ALL RF IN OUT 2000 73 74 25 71 75 ALL RF I
89. 3 On the Test Set a Press Preset b Change the Avg Pwr fieldto Chan Pwr c Verify the RF Channel is set at 384 d Select Calibrate under Chn Pwr Cal 4 Record the Chan Pwr measurement in the PTR table 7 30 CDMA Analyzer Channel Power Level Accuracy Test 29 Record on page 247 5 Repeat steps 2 and 3 for each of the data points listed in the PTR 6 For PCS frequencies a Setthe RF CHAN Std to US PCS b Verify the RF Channel is set at 525 The Chan Pwr Calisonly required when the frequency is changed 199 Performance Tests CDMA Analyzer Channel Power Level Accuracy Performance Test 29 200 S agilent e8285 ALR Book chapters perf_test im 7 Performance Test Records Use this chapter to record the results of the performance tests in Chapter 6 Performance Tests on page 141 NOTE Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set 201 Performance Test Records RF Generator FM Distortion Performance Test 1 Record RF Generator FM Distortion Performance Test 1 Record For test procedure see RF Generator FM Distortion Performance Test 1 on page 146 Table 7 1 RF Generator FM Distortion Test 1 Record RF Deviation Rate FM Di
90. 35 HOLDDOWN KEYMAT 8285 00038 HOLDDOWN PCB E8285 61052 HOLDDOWN TYPE N AY E8285 61053 GPIB SERIAL KIT E 8285 61843 HRN 20CNDCT 18AWG E8285 61033 HRN_PWR_SWITCH E 8285 61042 106 S agilent e8285 ALR Book chapters disassembly fm Disassembly and Replaceable Parts Parts List Description Part Number 1 9 MOD KIT 08924 61806 KEY MAT 8285 40001 KEYBOARD ASSY E8285 60141 KNOB 31 DIA E5515 21052 KNOB ASSY 3 8 0370 3409 MANUAL CD ROM E 8285 10004 MEASUREMENT_KIT 08920 61836 MEMORY_ SBRC KIT 6380 61801 MOD_DISTRIBUTION_KIT 08920 61809 MOTHER BD AY E8285 60101 MOTHERBOARD CHASSIS KIT E8285 61801 NUT HEX DBL CHAM 0590 2332 PCMCIA CARD READER KIT E 6380 61803 POWER SUPPLY 0950 2665 PROTOCOL PROC KIT E 8285 61813 RBN_10CNDCT28AWG 1253 0851 RBN_16CNDCT_28AWG E8285 61032 RBN_20CNDCT_28AWG 26 E 8285 61026 RBN_20CNDCT_28AWG 40 E 8285 61040 RBN_34CNDCT_28AWG E8285 61031 RBN 50CNDCT28AWG E8285 61021 RBN 68CNDC30AWG E8285 61019 RCVR_SYNTH_KIT 08921 61820 REAR_PANEL_CONNECTOR_ASSY E8285 60140 REAR PANEL KIT E8285 61810 RECEIVER KIT FW Rev A 02 XX and below E8285 61805 REFERENCE GUIDE E8285 90016 REGULATOR KIT E8285 61802 RF IO KIT FW Rev A 02 XX and below E 8285 61856 RF IO KI
91. 5 Service Screen Troubleshooting with the SERVICE Screen To change the counter connection move the cursor in front of the Counter Connection field and push thecursor control knob A Choices menu will appear then move the cursor to the desired circuit node and push the cursor control knob Gate Time This field is used to adjust the Test Set s internal frequency counter s gate time A shorter gate time may enable you to see frequency fluctuations that might not be seen using a longer gate time To change the gate time move the cursor in front of the Gate Time field and push the cursor control knob Rotate the cursor control knob until the desired gate time 10 to 1000m in 10m increments is displayed then press the cursor control knob Latch This field is used to manually alter the circuit latches that control switch DAC and gain settings within the Test Set The value of the selected latch is displayed and changed in the value field Some settings are read only set a switch DAC gain setting 1 Movethe cursor in front of the Latch field and push the cursor control knob A Choices menu will appear 2 Movethe cursor to the desired latch name and push the cursor control knob 3 Movethe cursor in front of the Value field and push the cursor control knob 4 Rotate the cursor control knob to modify the value hexadecimal NOTE If any of the switches DACs or gain settings are changed with the Latch fiel
92. 56 25 MHz Calculate rho using the above equation and record the result rho in table 7 28 CDMA Generator Modulation Accuracy Test 27 Record on page 245 195 Performance Tests CDMA Analyzer Average Power Level Accuracy Performance Test 28 CDMA Analyzer Average Power Level Accuracy Performance Test 28 The purpose of this test is to verify that the Test Set meets the specification limits in Performance Test Record table 7 29 CDMA Analyzer Average Power Level Accuracy Test 28 Record on page 246 The CDMA average power level accuracy is verified by comparing the measured power in a CW signal with the power level measured by a power meter Setup Figure 6 33 CDMA Analyzer Average Power Level Accuracy Test 27 goo S oo Signal Generator ao KO RF IN OUT OUTPUT Power Splitter Sensor Module Power Meter INPUT 502 Procedure 1 On the signal generator a Set the frequency to 881 52 MHz b Set the amplitude so the measuring receiver reads 0 dBm 196 S agilent e8285 ALR Book chapters perf_test fm Performance Tests CDMA Analyzer Average Power Level Accuracy Performance Test 28 2 On the Test Set f g Press Preset Select the CONFIGURE screen Setthe RF Display field to Freq Set the Gen An1 field to 0 MHz Select CDMA CALL CONTROL Set Tune Freq to 881 52 MHz Set the Avg Pwr Units to mW
93. 85 7 or 614 3 MHz TheLO is provided by the Receiver Synthesizer see Figure 8 4 on page 258 ThelF frequencies developed are as follows in Table 8 2 Table 8 2 Downconverter Signal Paths Tune IF Conversi n LOFilter RSYN 500 Frequency RF Filter Frequency Module LO freq 1000M Range MHz MHz range MHz 4 to 150 150 MHz LPF 614 3 high sideLO NA 614 7 764 3 150 to 150 386 MHz 614 3 high side LO NA 764 3 995 0 380 7 BPF 380 7 to 350 650 MHz 114 3 high sideLO NA 945 0 764 3 650 TBPF 650 to 800 600 1000 MHz 114 3 high side LO NA 764 3 914 3 TBPF 800 to 1000 600 1000 MHz 114 3 low sideLO NA 685 7 885 7 TBPF 1400 to 1400 2200 MHz 385 7 high side LO PDC Unlic PCS 892 85 1000 0 1614 3 TBPF 1600 2000 MHz 1614 3 to 1400 2200 MHz 385 7 low sideLO PCS 614 3 807 15 2000 TBPF 1200 1620 MHz gt 2000 to 1400 2200 MHz 385 7 low sideLO PDC Unlic PCS 807 15 907 15 2200 TBPF 1600 2000 MHz a This LO input is doubled to 1785 7 2000 MHz prior to mixing b This LO input is doubled to 1228 6 1614 3 MHz prior to mixing C This LO input is doubled to 1614 3 1814 3 MHz prior to mixing 255 Block Diagrams RF Analyzer Section Filters are automatically switched in to remove image and other interfering signals The frequency ranges of the filters are as follows 150 MHz low pass 150 MHz 386 MHz bandpass 350 MHz 650 MHz tunable bandpass 650 MHz 1000 MHz tunable bandpass
94. ALL RF IN OUT 1000 37 38 36 ALL RF IN OUT 1000 42 43 41 ALL RF IN OUT 1000 47 48 46 ALL RF IN OUT 1000 52 53 51 ALL RF IN OUT 1000 57 58 56 ALL RF IN OUT 1000 62 63 61 ALL RF IN OUT 1000 67 68 66 ALL RF IN OUT 1000 72 73 71 ALL RF IN OUT 1000 77 78 76 ALL RF IN OUT 1000 82 83 81 ALL RF IN OUT 1000 87 88 86 ALL RF IN OUT 1000 92 93 91 ALL RF IN OUT 1000 97 98 96 ALL RF IN OUT 1000 102 103 101 ALL RF IN OUT 1000 107 108 106 ALL RF IN OUT 1000 112 113 111 RF IN OUT 1000 117 118 116 The following entries are for the 2 GHz setup ALL DUPLEX OUT 1700 13 14 12 ALL DUPLEX OUT 1700 18 19 17 ALL DUPLEX OUT 1700 23 24 22 ALL DUPLEX OUT 1700 28 29 27 ALL DUPLEX OUT 1700 33 34 32 ALL DUPLEX OUT 1700 38 39 37 ALL DUPLEX OUT 1700 43 44 42 ALL DUPLEX OUT 1700 48 49 47 ALL DUPLEX OUT 1700 53 54 52 ALL DUPLEX OUT 1700 58 59 57 ALL DUPLEX OUT 1700 63 64 62 S agilent e8285 ALR Book chapters perf_record fm Performance Test Records RF Generator Level Accuracy Performance Test 5 Record 4 RF Level Level Limits dBm Revision Lower Upper Actual ALL DUPLEX OUT 1700 68 69 67 ALL DUPLEX OUT 1700 73 74 12 ALL DUPLEX OUT 1700 78 79 77 ALL DUPLEX OUT 1700 83 84 82 ALL DUPLEX OUT 1700
95. Accuracy Performance Test 29 on page 198 Table 7 30 CDMA Analyzer Channel Power Level Accuracy Test 29 Record Gen Freq RF Channel Level a Setting MHz MHz dBm or nee 836 52 384 11 10 25 11 75 836 52 384 6 5 25 6 75 836 52 384 1 0 25 1 75 836 52 384 4 4 75 3 25 836 52 384 9 9 75 8 25 836 52 384 14 14 75 13 25 836 52 384 19 19 75 18 25 1876 52 525 11 10 25 11 75 1876 52 525 6 5 25 6 75 1876 52 525 1 0 25 1 75 1876 52 525 4 4 75 3 25 1876 52 525 9 9 75 8 25 1876 52 525 14 14 75 13 25 1876 52 525 19 19 75 18 25 247 Performance Test Records 5 CDMA Analyzer Channel Power Level Accuracy Performance Test 29 Record ook chapters perf_record fm 8 Block Diagrams This chapter contains block diagrams and descriptions that focus on how the Test Set generates signal and performs measurements 249 Block Diagrams Signal Flow and Interconnections Signal Flow and Interconnections Shown in Figure 8 1 Signal Flow and Interconnections on page 252 is a block diagram overview of the Test Set For details on individual assemblies refer to Table 8 1 on page 251 This chapter is organized into the following sections which provide detailed view of each individual assembly shown in the overview RF Input Output RF Analyzer Audio Analyzer CDMA Analyzer
96. Agilent Technologies E8285A CDMA Mobile Station Test Set Assembly Level Repair Firmware Version A 01 29 to A 02 04 100 1000 1700 2000 MHz Firmware Version A 04 53 and above 800 1000 1700 2000 MHz Agilent Part Number 8285 90033 Revision C Printed in U S A J une 2000 2258 Agilent Technologies 444 Innovating the HP Way Notice Information contained in this document is subject to change without notice All Rights Reserved Reproduction adaptation or translation without prior written permission is prohibited except as allowed under the copyright laws This material may be reproduced by or for the U S Government pursuant to the Copyright License under the clause at DFARS 52 227 7013 APR 1988 Copyright 2000 Agilent Technologies S agilent e8285 ALR Book chapters front fm Manufacturer s Declaration This statement is provided to comply with the requirements of the German Sound mission Directive from 18 J 1991 This product has a sound pressure emission at the operator position lt 70 dB A e Sound Pressure Lp 70 dB A At Operator Position Normal Operation e According to ISO 7779 1988 EN 27779 1991 Type Test Herstellerbescheinigung Diese Information steht im Zusammenhang mit den Anforderungen der Maschinenlarminformatio
97. F Level Firmware Auto All 92 Offset A 01 26 Hold All On Ott State Auto Time Total RAM 8 896 kB utput Port Serial RF Out US39090053 Display dB To Screen User Mssas Yes No Input Atten Auto Hold 10 dB Input Port COMA TimeBase uto Int Internal Alt Pur Ms Cal Bands None Frame Clock SERVICE V N ocTOVp Freauency IN 4 90483 1 4452 Voltmeter Connection Voltage Counter Connection AUDL COUNT Gate Time To Screen hex Confia RAM Initialize CONFIG Clear 011 RAM and restart Gate Time This field is used to adjust the Test Set s internal frequency counter s gate time A shorter gate time may enable you to see frequency fluctuations that might not be seen using a longer gate time To change the gate time use the knob to select the Gate Time field When you select the field a flashing gt gt cursor is displayed Rotate the cursor control knob until the desired gate time 10 to 1000 ms in 10 ms increments is displayed then press the cursor control knob 80 S agilent e8285 ALR Book chapters trouble fm Troubleshooting Service Screen Module This field is used to manually select the module that contains the circuit latches to be selected Latch This field is used to manually select the circuit latches in the module selected in the Module f
98. Freqto 1700 MHz 3 On the measuring receiver a Set the measurement mode to RF power b Key in 1700 MHz c Measure and record the RF power at the DUPLEX OUT port 4 On the Test Set set the RF Gen Freqto 2000 MHz 5 On the measuring receiver a Key in 2000 MHz b Measure and record the RF power at the DUPLEX OUT port 160 S agilent e8285 ALR Book chapters perf_test fm Performance Tests RF Generator Level Accuracy Performance Test 5 6 On the signal generator set the level to 8 dBm or whatever level is suitable for the microwave converter s LO input 7 For frequencies of 1700 and 2000 MHz perform the following a On the signal generator set the frequency to 1900 MHz CW and 2200 MHz CW respectively Reset the measuring receiver On the measuring receiver set the frequency offset mode to enter and enable the LO frequency 27 3 Special then key in the signal generator LO frequency in MHz which is 1900 or 2200 MHz respectively On the measuring receiver set the measurement mode to tuned RF level and the measurement units to dBm then press SET REF Measure and record the RF level at the levels down to and including 83 dBm shown in the PTR at the Test Set s DUPLEX OUT port If the measuring receiver displays the need to recalibrate press the CALIBRATE key and wait for calibration to be completed After recording the reading at 83 dBm insert an RF amplifier into the output of the Test Set Record the
99. G 1 CELL from LO IF DEMOD Q_DEMOD from PROTOCOL PROCESSOR RESET PROTO RESET pin 2 BD NUM BD PRES CARD TO RP EDGE CSD1_SER_B CSD1 SER A DIGITAL CELL SITE 2 TRIGGERS ADRS DATA IF GAIN 16xCHIP 1 25ms 20ms NC 26 67ms NC PP2S 8 8 2 4 8 CS2M3lQ to ANALOG _ CELL Q_DEMOD RESET BD NUM BD PRES CARD RP EDGE CSD2 SER B DB BA CSD2 SER A 260 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams RF Analyzer Section Figure 8 7 Analog Cell Site FW Rev A 04 54 and below ANALOG CELL SITE PP2S FROM PMF 8xCHIP from DIGITAL CELLSITE 1 TO IQ_MOD fom DIGITAL lt _ J RP CELLSITE 2 Wakapa a ei ete C asit RELAY DIAGNOSTICS in CSA TO MEAS MEM SBRC DIAG AUD 1 261 Block Diagrams RF Analyzer Section Figure 8 8 Analog Cell Site FW Rev A 05 03 and above ANALOG CELL SITE AWGN amp SIN COS ROM OUTPUT 51 110 TO IQ MOD FROM CS1M21Q ASSY DIGITAL CELLSITE 1 CS1M3IQ 51 410 OUTPUT 52 110 52 210 FROM DIGITAL CELLSITE 2 CS2M3IO 52 410 REAR PANEL HOST SERIAL SW Drive Control TERM_SW_DRV S agilent e8285 alr book graphics analog_cellsite_new eps 262 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams RF Analyzer Section Figure 8 9 Pr
100. Generator 190 Average Power Level Accuracy CDMA Analyzer 196 Channel Power Level Accuracy CDMA Analyzer 198 DC Level Accuracy AF Analyzer 174 DC Level Accuracy AF Generator 168 Distortion AF Analyzer 173 equipment required 142 FM Accuracy RF Analyzer 180 FM Accuracy RF Generator 149 FM Bandwidth RF Analyzer 184 FM Distortion RF Analyzer 182 FM Distortion RF Generator FM Flatness RF Generator 152 Frequency Accuracy AF Generator 170 Frequency Accuracy to 100 kHz AF Analyzer 175 Frequency Accuracy to 400 kHz AF Analyzer 176 Harmonics Spectral Purity RF Generator 163 how to use 142 Image Rejection Spectrum Analyzer 188 Level Accuracy RF Analyzer 179 Level Accuracy RF Generator 158 Modulation Accuracy CDMA Generator 192 194 recommended interval 38 142 Residual Distortion AF Generator 169 Residual FM RF Analyzer 186 Residual FM RF Generator 155 Residual Noise AF Analyzer SINAD Accuracy AF Analyzer 173 Spurious Spectral Purity RF Generator 165 performance verification overview 38 periodic adjustments accessing 128 Audio Analyzer 1 Offset 134 Audio Frequency Generator Gain 133 External Modulation Path Gain 134 IQ Calibration 137 location of voltmeter connections 133 selecting and running 130 system power calibration program SY SPWRO 39 Timebase Reference Using a Counter 132 Timebase Reference Using a Sourc
101. LL DUPLEX OUT 800 51 52 50 211 Performance Test Records RF Generator Level Accuracy Performance Test 5 Record E LM RF Level Level Limits dBm Revision Lower Upper Actual ALL DUPLEX OUT 800 56 57 55 ALL DUPLEX OUT 800 61 62 60 ALL DUPLEX OUT 800 66 67 65 ALL DUPLEX OUT 800 71 72 70 ALL DUPLEX OUT 800 16 77 75 ALL DUPLEX OUT 800 81 82 80 ALL DUPLEX OUT 800 86 87 85 ALL DUPLEX OUT 800 91 92 90 ALL DUPLEX OUT 800 96 97 95 ALL DUPLEX OUT 800 101 102 100 ALL DUPLEX OUT 800 106 107 105 ALL DUPLEX OUT 800 111 112 110 ALL DUPLEX OUT 800 116 117 115 ALL RF IN OUT 800 22 23 21 ALL RF IN OUT 800 27 28 26 ALL RF IN OUT 800 32 33 31 ALL RF IN OUT 800 37 38 36 ALL RF IN OUT 800 42 43 41 ALL RF IN OUT 800 47 48 46 ALL RF IN OUT 800 52 53 51 ALL RF IN OUT 800 57 58 56 ALL RF IN OUT 800 62 63 61 ALL RF IN OUT 800 67 68 66 ALL RF IN OUT 800 72 73 71 ALL RF IN OUT 800 77 78 76 ALL RF IN OUT 800 82 83 81 ALL RF IN OUT 800 87 88 86 ALL RF IN OUT 800 92 93 91 ALL RF IN OUT 800 97 98 96 212 sjagilent e8285 ALR Book chapters perf_record fm Performance Test Records RF Generator Level Accuracy Performance Test 5 Record
102. N OUT 2000 78 79 25 76 75 ALL RF IN OUT 2000 83 84 25 81 75 ALL RF IN OUT 2000 88 89 25 86 75 ALL RF IN OUT 2000 93 94 25 91 75 ALL RF IN OUT 2000 98 99 25 96 75 ALL RF IN OUT 2000 103 104 25 101 75 ALL RF IN OUT 2000 108 109 25 106 75 ALL RF IN OUT 2000 113 114 25 111 75 ALL RF IN OUT 2000 118 119 25 116 75 217 Performance Test Records RF Generator Harmonics Spectral Purity Performance Test 6 Record RF Generator Harmonics Spectral Purity Performance Test 6 Record For test procedure see RF Generator Harmonics Spectral Purity Performance Test 6 on page 163 Table 7 6 RF Generator Harmonics Spectral Purity Test 6 Record E Level RF Freq Harmonic Harmonie Revision Number Upper Actual lt A 02 XX 10 30 2nd 18 000 lt 02 10 30 3rd 18 000 A 02 XX 10 50 2nd 18 000 lt 02 10 50 3rd 18 000 A 02 XX 10 100 2nd 18 000 A 02 XX 10 100 3rd 18 000 lt 02 10 200 2nd 18 000 lt 02 10 200 3rd 18 000 A 02 XX 10 300 2nd 18 000 lt 02 10 300 3rd 18 000 lt 02 10 400 2nd 18 000 A 02 XX 10 400 3rd 18 000 lt 02 10 500 2nd 18 000 lt 02 10 500 3rd 18 000 A 02 XX 10 600 2nd 18 000 lt 02 10 600 3rd 18 000 lt 02 10 700 2nd 18 000 A 02 XX
103. NOTE Figure 2 14 To run the Functional Diagnostics see Accessing the Diagnostic Tests on page 58 The diagnostics are intended to help in locating the source of catastrophic failures Occasionally a test will fail with the test results being only slightly out of limits Such failures do not necessarily indicate that the Test Set is operating outside of its published specifications or that it is otherwise faulty Further testing such as running the performance tests will be required in such cases Many of the internal diagnostic and calibration procedures use low level latch commands to control the instrument settings Many latch settings persist even through a preset They can only be reset by an instrument power down or by explicitly reseting each latch This phenomenon is the reason the message Direct latch write occurred Cycle power when done servicing is displayed the first time a latch is written to Because latch settings persist problems can arise in running these programs For example prematurely terminating a test in a diagnostic using the Pause and Exit keys and restarting another test may cause failures in that test because of improper latch settings It is best to run tests to completion before starting another one Also be sure to cycle the power off and on when done servicing the Test Set Functional Diagnostics Screen TESTS IBASIC Controller SERVICE MENU Move pointer to the desired program using the k
104. STD C_MESS FLTR 6KHZ BPF 4014 90 sS3agilente8285ALRBook chapters disassembly fm NOTE Figure 3 5 Disassembly and Replaceable Parts Disassembly Procedures Replacing the Controller Restoring Calibration Data in Controller Assembly Calibration data for the entire Test Set is stored in EEPROM on the controller CONTROLLER_ KIT assembly see Figure 3 5 When replacing the controller assembly you must remove the CAL MODULE daughter board from the old controller assembly and install it onto the replacement controller assembly to preserve the calibration data for the instrument Boot Code is the firmware that initializes the Test Set on power up It also is used at power up to see if a firmware revision card has been inserted in the PCMCIA card port This code is stored in the CAL MODULE daughter board on the controller CONTROLLER_ KIT assembly If a new version of boot code needs to be installed carefully remove the old daughter board and insert the new one being careful of the orientation To replace the controller assembly 1 Removethe external and internal covers see External and Internal Covers on page 87 2 Locate the controller board see Figure 3 3 on page 89 disconnect the ribbon cables see Figure 3 5 and pull it out from the Test Set 3 Carefully remove the CAL MODULE daughter board from the original assembly and install it on the replacement Controller and CAL MODULE
105. Set or if an application problem exists outside of the Test Set Several assemblies when replaced require running specific periodic calibration procedures to create calibration factors for that assembly other cases the calibration data will be included with the replacement assembly on a memory card Instructions that come with the replacement assembly explain how to download the calibration data This is not considered part of periodic calibration When troubleshooting the Test Set it is sometimes desirable to swap a known good assembly perhaps from another Test Set for a suspected faulty assembly If the swapped assembly requires calibration data most assemblies will operate well enough with the original assembly s calibration data to troubleshoot and run the diagnostics H owever do not expect the Test Set to meet its specifications Also some assemblies may appear to fail because of the incorrect calibration data 38 S agilent e8285 ALR Book chapters intro fm Introduction System Power Calibration Program System Power Calibration Program This adjustment program is not found in ROM of the Test Set This program resides on a PCMCIA Memory Card part number 6380 61811 It has to be downloaded from the memory card This program generates system power calibration factors for the Test Set The purpose of this program is to generate calibration factors for the RF Input Output Section This assures that the Test Set wil
106. Set the tuning for the signal generated by the Test Set Connect the analyzer s input to the Test Set s DUPLEX OUT connector 3 Set the Test Set s RF Gen Freq to 1800 MHz and then 900 MHz For each frequency the external RF analyzer should read as follows a b Power should read approximately 0 001 W for each frequency Frequency should read 1800 and 900 MHz respectively S agilent e8285 ALR Book chapters trouble fm Troubleshooting Service Screen Service Screen A large number of latch and DAC settings used throughout the Test Set can also be read and or set to alter standard operation The SERVICE screen uses the internal voltmeter and frequency counter functions to monitor specific nodes in most assemblies These functions are primarily intended to allow the automated internal diagnostic routines to verify proper instrument operation and to allow the internal periodic adjustment routines to modify Test Set operation Use these functions for further troubleshooting when the diagnostics cannot isolate a failure to a specific assembly To do this you must understand how to operate the Test Set and especially understand how the assemblies in the Test Set work together To Access the SERVICE Screen 1 Press the Config key on the Test Set 2 On the CONFIGURE screen rotate the Test Set s selector knob and select SERVICE see figure 2 21 The SERVICE screen appears For field descriptions see Field Names and De
107. Signal Analyzer 55 96 DUPLEX OUT INPUT Procedure 1 On the Test Set a Press Preset Select the CONFIGURE screen Set the RF Display field to Freq Set the Gen An1 field to 0 MHz Set the Output Port field to Dupl Select the CDMA CALL CONTROL screen Set the RF Gen Freq field to 881 52 MHz c m Selectthe CDMA GENERATOR CONTROL screen Set the Sert Pwr 0 10 dBm Turn off the Synth Pager and Traffic fields Set the Pilot field 0 194 S agilent e8285 ALR Book chapters perf_test fm Performance Tests CDMA Generator Modulation Accuracy Performance Test 27 On the Vector Signal Analyzer Press the Frequency key Set center frequency to 881 52 MHz Set the span to 2 6 MHz Press the Instrument Mode key 7 P Press the Digital Demodulation F4 key Press the Demodulation Setup F5 key Press the Demodulation Format F1 key Press the Standard Setup F7 key Press the CDMA Base F7 key j Press the D key k Read the Rho measurement or Use the following equation to calculate rho 1 2 1 p rho EVM Error Vector Magnitude rms Compare and record the rho error calculated in table 7 28 CDMA Generator Modulation Accuracy Test 27 Record on page 245 Set the CDMA GEN frequency on the Test Set and change the center frequency on the Vector Signal Analyzer to the 19
108. T FW Rev A 04 5X and above E 8285 61860 107 Disassembly and Replaceable Parts Description Part Number RF_COVER_AY E 8285 61008 RF_OUTPUT_KIT FW Rev A 02 XX and below 6380 61832 RF OUTPUT KIT FW Rev A 04 5X and above E8285 61859 SCR MACH_MS10 8 0515 2694 SHIELD_DISPLAY E 8285 00054 SIGGEN_SYNTH_KIT 08921 61819 SIGNAL_SOURCE_KIT 08920 61850 SMM3 0_12SEMPNTX 0515 0664 5 3 0 18 PN TX 0515 0682 5 3 0 6 FL TX 0515 1227 SMM3 0 6SEMPNTX 0515 2126 SMM3 0 8 FL TX 0515 1102 SMM3 0 8SEMPNTX 0515 0372 5 4 0 105 0515 0380 5 4 0 125 0515 2243 5 4 0 165 0515 2245 5 4 0 20 0515 0456 SMM4 0 6 PN TX 0515 0684 SPEAKER ASSY 8285 61044 SPECTRUM ANALYZER KIT 08920 61852 SR 2 18 SMA SMA E8285 61024 SR 2 18 SMA SMA E 8285 61028 SR_3 58 SMA SMA 15 E8285 61015 SR_3 58 SMA SMA 16 E 8285 61016 SR_3 58 SMA SMA 17 8285 61017 SR_3 58 SMA SMA 22 E 8285 61022 SR_3 58 SMA SMA 25 E8285 61025 STDF 327L 6 32 0380 0644 TERMINATION 0960 0053 TRANSIT CASE E8285 90012 108 s agilent e8285 ALR Book chapters disassembly fm Disassembly and Replaceable Parts Parts List Description Part Number TRIM_STRIP_1 5041 9173 TRIM_STRIP_2 5041 9176 UPCONV_ KIT FW RevA 02 XX a
109. Test Set level to 15 dBm After the measuring receiver has acquired the signal set the measuring receiver to measure tuned RF level Measure the RF level at the levels shown in the PTR at the Test Set s DUPLEX OUT port and compare the measured RF level to the limits If the measuring receiver displays the need to recalibrate press the CALIBRATE key and wait for calibration to be completed Move the sensor module to the Test Set s RF IN OUT port On the Test Set set the Output Port field to RF Out and repeat the measurements for the levels shown in the PTR and compare the measured RF level to the limits Move the sensor module back to the Test Set s DUPLEX OUT port and set the Output Port to Dupl 159 Performance Tests RF Generator Level Accuracy Performance Test 5 Setup 2 Figure 6 10 Setup 2 for Measurements of 1700 and 2000 MHz Gaz J e E RF IN OUT DUPLEX OUT E INPUT AMPLIFIER 1 OUTPUT Microwave Measuring Receiver RF Converter input Signal Generator _ INPUT 500 59 lt LO RF INPUT OUTPUT IF OUTPUT Procedure 2 Steps 1 to 5 in the following procedure apply to Setup 2 shown in figure 6 10 on page 160 1 Make the connections as shown on Setup 2 2 On the Test Set a Set the Amplitude to 11 dBm b Setthe RF Gen
110. Wd 135753173 WL SNYOLNY 130 ONv8 OL 40193130 OL 3Suvo5 704327130 HIHN NI 05 24 81 130 QNV8 IH OL OL gpz 136 NALLY 735733174 135 YVA c INAL SNId V V V ZHW 000 009 lt ____ 5 ZHWOSL N IS ZHWOS9 ose lt 2 PS L 2 L INAL 7185 39 ZHWZ SBE lt S30 gens Ovid 8H Qvd 7 8 st dd 257 Block Diagrams RF Analyzer Section v v v 1N3S33d 51201 40 100 n 79 4 2 a 2 nN lt a 2 2 o z EE ZE N J N 1409 1N3S3Hd 438 3301 40 100 lt c gt 122422222222 gt 2 y aws Egy E Ed QW zr 7 Jay 000 7005 NASM ZHW 000 005 W os H noaa JeyieAuoouMOQ 01 ZHWOOSL 3 HINAS 5 5 258 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams RF Analyzer Section 31 01 lt 235 lt H2T300S SV IWYS 8 1 58 9 41 El Ed My
111. X DUPLEX OUT 30 116 117 115 210 sjagilent e8285 ALR Book chapters perf_record fm Performance Test Records RF Generator Level Accuracy Performance Test 5 Record 4 RF Level Level Limits dBm Revision Lower Upper Actual lt A 02 XX RF IN OUT 30 22 23 21 lt 02 RF IN OUT 30 27 28 26 lt 02 RF IN OUT 30 32 33 31 lt 02 RF IN OUT 30 37 38 36 lt 02 RF IN OUT 30 42 43 41 lt 02 RF IN OUT 30 47 48 46 lt 02 RF IN OUT 30 52 53 51 lt 02 RF IN OUT 30 57 58 56 lt 02 RF IN OUT 30 62 63 61 lt A 02 XX RF IN OUT 30 67 68 66 lt A 02 XX RF IN OUT 30 72 73 71 lt A 02 XX RF IN OUT 30 77 78 76 lt 02 RF IN OUT 30 82 83 81 lt 02 RF IN OUT 30 87 88 86 lt 02 RF IN OUT 30 92 93 91 lt 02 RF IN OUT 30 97 98 96 lt 02 RF IN OUT 30 102 103 101 lt A 02 XX RF IN OUT 30 107 108 106 lt A 02 XX RF IN OUT 30 112 113 111 lt A 02 XX RF IN OUT 30 117 118 116 ALL DUPLEX OUT 800 11 12 10 ALL DUPLEX OUT 800 16 17 15 ALL DUPLEX OUT 800 21 22 20 ALL DUPLEX OUT 800 26 27 25 ALL DUPLEX OUT 800 31 32 30 ALL DUPLEX OUT 800 36 37 35 ALL DUPLEX OUT 800 41 42 40 ALL DUPLEX OUT 800 46 47 45 A
112. You Start CAUTION Perform the procedures in this chapter only at a static safe work station The printed circuit assemblies in this instrument are sensitive to static electricity damage Wear an anti static wrist strap that is connected to earth ground NOTE Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set Recommended Torque Screws Tighten until just snug use care not to strip threads Tools RF connectors SMA type 9 0 Ib in 102 N cm SMC type 6 0 Ib in 68 N cm more of the following tools may be required to access and remove Test Set s assemblies TX 10 Torx screwdri ver TX 15 Torx screwdri ver Flat blade screwdriver 7 mm socket wrench 1 16 inch allen wrench 3 16 inch socket wrench 1 4 inch open end wrench 5 16 inch open end wrench 29 mm socket 84 S agilent e8285 ALR Book chapters disassembly fm Disassembly and Replaceable Parts Before You Start Ordering Replacement Parts and Support Repair assistance is available from the factory by phone and email When calling or writing for repair assistance please have the following information ready Instrument model number Instrument serial number tag located on the rear panel Installed options if any tag located on the rear panel nstrument
113. agilent e8285 ALR Book chapters perf_test fm Performance Tests RF Analyzer FM Bandwidth Performance Test 22 2 On the audio analyzer a Reset the instrument b Set the output frequency to 1 kHz c Set the output amplitude to 1 4 V 3 On the signal generator a Set the output frequency to 840 MHz b Set the output amplitude to 0 0 dBm c Set the function to FM with EXT AC Modulation d Set the MOD LEVEL to 25 kHz 4 On the Test Set a Press Preset b Select the CONFIGURE screen c Setthe RF Display field to Freq d Select the RF ANALYZER screen e Setthe Tune Freqto 840 MHz Set the Input Port field to Ant Set the IF Filter field to 230 kHz B o Set the Squelch field to Open Select the AF ANALYZER screen a j SettheAF Infield to FM Demod Setthe Filter 2 field to gt 99kHz LP l Set the Detector field to Pkt 5 Set the audio analyzer to the following frequencies 20 Hz 100 Hz 1 kHz 10 kHz 35 kHz and 70 kHz For each frequency adjust the audio analyzer s level until the measuring receiver reads 25 kHz FM deviation and record the deviation read on the Test Set 6 Of the FM deviations measured by the Test Set find the maximum and minimum deviations and make the following calculation dB 20 log ee Minimum Deviation Record the dB difference in the Performance Test Record and compare it with the limits shown 185 Performance Tests RF Analyzer Residual FM Perfor
114. analyzer in accordance with its operating manual 2 On the Test Set Press Preset Select the CONFIGURE screen Set the RF Display field to Freq Set the RF Offset to Off eo Set the Output Port field to Select the RF GENERATOR screen Set the Amplitude to 10 dBm mmm Setthe RF Gen Freq field to the appropriate RF frequency based on the firmware revision see NOTE above from the Performance Test Record 165 Performance Tests RF Generator Spurious Spectral Purity Performance Test 7 3 Set the Test Set s RF generator to the frequencies shown in the Performance Test Record PTR and measure the level of the spurious signals at the frequencies shown For each measurement convert the harmonic level to dB below the fundamental dBc and compare the computed levels to the limits 166 S agilent e8285 ALR Book chapters perf_test fm Performance Tests AF Generator AC Level Accuracy Performance Test 8 AF Generator AC Level Accuracy Performance Test 8 Setup Figure 6 13 Procedure The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 8 AF Generator AC Level Accuracy Test 8 Record on page 223 There are two audio generators AC level accuracy is measured directly with a digital multimeter Y I Y 8 Multimeter 88 558 5
115. analyzer s source to 1 kHz and 5 V and fine adjust the level until the voltmeter reads 5 V 177 Performance Tests Oscilloscope Amplitude Accuracy Performance Test 18 4 Set the frequency as shown in the Performance Test Record PTR For each setting perform the following a Adjust the level until the digital multimeter reads 5 V b Set Controls to Main and adjust the Time Div on the Test Set to display 2 to 3 cycles of the waveform c Set Controls to Marker and press the knob with the cursor in the Marker To field to move the marker to the peak of the waveform d Read the Lv1 and compare the reading to the limits in the PTR 178 S agilent e8285 ALR Book chapters perf_test fm Performance Tests RF Analyzer Level Accuracy Performance Test 19 RF Analyzer Level Accuracy Performance Test 19 Procedure Figure 6 24 Signal Generator The purpose of this test is to verify that the Test Set meets the specification limits in Performance Test Record table 7 19 RF Analyzer Level Accuracy Test 19 Record on page 236 Level accuracy is measured using a system power calibration program that resides on a memory card 1 Obtain the memory card see Table 6 1 on page 143 containing the System Power Calibration software program 2 Run the System Power Calibration as follows a b 4 Insert the memory card into the memory card slot Select the SOFTWARE MENU screen Set the Select P
116. asure about 5volts The 12 Volt reference MEAS NEG 12V REF should measure about 5 volts Many of the voltage measurements are only valid after a number of instrument settings are changed 294 S3agilente8285 AL R Book chapters service scrn fm Service Screen Troubleshooting with the SERVICE Screen When run the diagnostic routines make the necessary circuit changes and measurements automatically comparing the measurements to known limits for each node Figure 9 1 CONFIGURE and SERVICE Screens CONFIGURE Range Hold RF Level Firmware 11 EEE rea Chan Offset R 01 26 Hold All On Off Statetfuto Total RRM 896 kB Notch Coupl Output Port Serial 1539090053 RFGenl Hone RFGen Volts dB To Screen Input Atten Buto Hold Input Port e COMA 10 dB 1 TineBase Buto Int Internal Alt Pur Ms Frane Clock Cal Bands SERVICE Freauency To 4 90483 1 4452 Voltmeter Connection MEAS_12V_REF voltase Counter Connection AUDI COUNT Gate Time To Screen ns Module Rudio Rnalvzer 1 Latch audl input select Value hex Confis RRM Initialize CONFIG Clear all RAM and restart Counter Connection This field selects the desired circuit node to connect to the Test Set s internal frequency counter The reading is displayed in the Frequency measurement field at the top right of the display 29
117. bly fm Disassembly and Replaceable Parts Disassembly Procedures PCMCIA Assembly To remove this assembly disconnect the ribbon cable and 2 screws securing the assembly Figure 3 13 PCMCIA Assembly Removal SMM4 0_10SEMPNTX PCMCIA_CARD_READER KIT 97 Disassembly and Replaceable Parts Disassembly Procedures Motherboard Assembly 1 Remove the external and internal covers see xternal and Internal Covers on page 87 2 Removeall top and bottom side subassemblies from the Test Set see previous disassembly procedures 3 Remove the bracket relay from the chassis see Figure 3 14 4 Remove the screws securing the motherboard to the chassis Figure 3 14 Motherboard Disassembly SMM4 0_10SEMPNTX Qty 13 SMM4 0_20MML Qty 12 SMM4 0_10SEMPNTX Qty 13 T BRACKET RELAY RD BRKT SMB GRD 5 5 4 0 105 MOTHERBOARD Qty 13 98 s agilent e8285 ALR Book chapters disassembly fm Disassembly and Replaceable Parts Disassembly Procedures Front Panel Assembly The front panel assembly must be removed from the Test Set s chassis before any of the front panel subassemblies can be removed 1 Remove the external and internal coyers see E xternal and Internal Covers on page 87 2 Remove the cables BNC nuts and 6 screws securing the front panel frame to the Test Set s chassis see Figure 3 15 3 See Figure 3 16 on page 100 toidentify the desired subassembl
118. cords AF Analyzer Distortion and SINAD Accuracy Performance Test 14 Record Table 7 14 AF Analyzer Distortion and SINAD Accuracy Test 14 Record 2 to 2 rci t Distortion and SINAD Limits kHz Lower Upper Actual 2 100 Distortion 8 856 11 144 96 2 100 SINAD 19 043 dB 21 043 dB 3 100 Distortion 8 856 11 144 3 100 SINAD 19 043 dB 21 043 dB 2 10 Distortion 0 890 1 120 96 2 10 SINAD 39 000 dB 41 000 dB 3 10 Distortion 0 890 1 120 96 3 10 SINAD 39 000 dB 41 000 dB 2 5 Distortion 0 445 0 560 2 5 SINAD 45 021 dB 47 021 dB 3 5 Distortion 0 445 0 560 3 5 SINAD 45 021 dB 47 021 dB 231 Performance Test Records AF Analyzer DC Level Accuracy Performance Test 15 Record AF Analyzer DC Level Accuracy Performance Test 15 Record For test procedure see AF Analyzer DC Level Accuracy Performance Test 15 on page 174 Table 7 15 AF Analyzer DC Level Accuracy Test 15 Record AF Generator DC Voltage Limits mV 1 Level mV Lower Upper Actual 5000 4905 000 5095 000 500 450 000 550 000 232 S agilent e8285 ALR Book chapters perf_record fm Performance Test Records AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 Record AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 Record For test procedure see AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 on page 175
119. d the Test Set will generate the message Direct latch write occurred Cycle power when done servicing Tocdear this message cydethe Test Set s power U pon power up the internal controller will return the Test Set toits default settings and values Thefirst part of the names in the Choices menu relates tothe assembly where the switch DAC or gain setting is located Some latch names are not listed here dstr Modulation Distribution e audl Audio Analyzer 1 aud2 Audio Analyzer 2 refs Reference inpt Input 296 5 2851 R Book chapters service scrn fm Service Screen Troubleshooting with the SERVICE Screen out Output r r Receiver gsyn Signal Generator Synthesizer rsyn Receiver Synthesizer spec Spectrum Analyzer meas Measurement metron Measurement afgl Signaling Source Analyzer afg2 Signaling Source Analyzer sgnl Displays version number of the Signaling Source Analyzer firmware cellSitel Cell Site 1 Digital board cellSite2 Cell Site 2 Digital board cdmaRef CDMA Reference iq mod 1 0 Modulator loif LO IF Demod main dsp Main DSP Receiver aux dsp optional DSP Receiver protocol Protocol Processor Value hex This field displays and changes the value for the latch shown in the Latch field RAM Initialize Selecting this field clears all SAVE registers and test programs and any initialized RAM disk s that may RAM It also resets all latches to t
120. dquarters 5200 blue Lagoon Drive Suite 4950 Miami Florida 33126 U S A tel 305 267 4245 fax 305 267 4286 Australia New Zealand Agilent Technologies Australia Pty Ltd 347 Burwood Highway Forest Hill Victoria 3131 tel 1 800 629 485 Australia fax 61 3 9272 0749 tel 0 800 738 378 New Zealand fax 64 4 802 6881 Asia Pacific Agilent Technologies 19 F Cityplaza One 111 Kings Road Taikoo shing Hong Kong SAR tel 852 2599 7899 fax 852 2506 9233 11 Table 2 12 Agilent Technologies E8285A Support Contacts The documentation supplied with your Test Set is an excellent source of reference application and service information Please use these manuals if you are experiencing technical problems Support Documentation User s Guide Quick Reference Guide Application Guide Assembly Level Repair Reference Guide CD ROM If you have used the manuals and still have application questions contact your local Agilent Technologies Sales Representative Repair assistance 15 available for the Agilent 8285 CDMA Mobile Station Test Set from the factory by phone and e mail External and internal Agilent users can contact the factory via email Parts information is also available from Agilent When calling or writing for repair assistance please have the following information ready Instrument model number E8285A nstrument Serial Nu
121. e 132 Variable Frequency Notch Filter 134 Voltmeter References 133 periodic calibration recommended interval 38 SeeAlso periodic adjustments phone CDMA mobile test functional 121 power supply LEDs 49 removing 102 test points 50 power supply regulator See Regulator assembly power up diagnostics 48 power up failures 49 printer setup 60 process efficiency recommendations 113 Protocol Processor assembly 32 Index 303 Index R RAM Initialize fidd SERVICE screen 81 RAM clearing 81 Revr Synth assembly troubleshooting 73 Receive DSP assembly 32 Received Signal Downconversion diagram 30 Reference assembly 30 33 troubleshooting 73 references frequency 28 Regulator assembly 284 repair process overview 37 replacing batteries 92 Residual Distortion AF Generator performance test 169 Residual FM RF Analyzer performance test 186 Residual FM RF Generator performance test 155 Residual Noise AF Analyzer performance test 172 RF analysis path 30 RF analyzer troubleshooting 75 RF Diagnostics See diagnostics RF generation path diagram 35 RF IN OUT connector 30 RF IN OUT port 34 RF signal generation 33 RF source troubleshooting 77 ROM boot replacement 91 304 S save recall register 49 self test diagnostics 48 self test failures 48 SERVICE screen 294 accessing 79 Counter Connection field 79 field names and descriptions 294 Gate T
122. e Detector field to PK 5 For each RF output from the signal generator shown in the Performance Test Record PTR do the following a a Set the audio analyzer s frequency rate as shown in the PTR Set the appropriate Filter 2 on the Test Set and LP Filter on the measuring receiver to match the output frequency of the audio analyzer Adjust the audio analyzer s level until the measuring receiver reads the FM deviation shown in the PTR Read the FM deviation on the Test Set and compare the results to the limits shown in the PTR 181 Performance Tests RF Analyzer FM Distortion Performance Test 21 RF Analyzer FM Distortion Performance Test 21 The purpose of this test is to verify that the Test Set meets the specification limits in Performance Test Record table 7 21 RF Analyzer FM Distortion Test 21 Record on page 239 An audio signal from the audio analyzer provides FM for the signal generator The signal generator provides an RF signal with FM to the Test Set s internal RF analyzer The measuring receiver is used to monitor FM deviation as the level of the audio signal from the audio analyzer is varied The audio analyzer then measures distortion introduced by the Test Set Setup Figure 6 26 AUD MONITOR OUTPUT Back p Audi
123. e Test 19 Record RF Analyzer FM Accuracy Performance Test 20 Record RF Analyzer FM Distortion Performance Test 21 RF Analyzer FM Bandwidth Performance Test 22 Record ii RF Analyzer Residual FM Performance Test 23 Spectrum Analyzer mage Rejection Performance Test 24 23 Contents 24 CDMA Generator RF IN OUT Amplitude Level Accuracy Performance Test 25 CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26 CDMA Generator Modulation Accuracy Performance Test 27 CDMA Analyzer Average Power Level Accuracy Performance Test 28 CDMA Analyzer Channel Power Level Accuracy Performance Test 29 8 Block Diagrams Signal Flow and Interconnections RF Input Ouiput SAO eee Reed eee eee Analyze SOON cod bed nae ad aah Analyzer Section dine COMA Analyzer Section ss Rok CDMA Generator Sedia erga ata dedos eee Audio G
124. e measuring receiver and the Test Set and note the frequency difference Compare the calculated difference to the limits shown in the Performance Test Record 176 S agilent e8285 ALR Book chapters perf_test fm Performance Tests Oscilloscope Amplitude Accuracy Performance Test 18 Oscilloscope Amplitude Accuracy Performance Test 18 The purpose of this test is to verify that the Test Set meets the specification limits in Performance Test Record table 7 18 Oscilloscope Amplitude Accuracy Test 18 Record on page 235 A 5 V ac signal from the audio analyzer is measured by both an external multimeter and by the Test Set s internal oscilloscope Since the oscilloscope reads peak volts the RMS reading of the multimeter is multiplied by the square root of two Setup Figure 6 23 TES e H 2 Se ele oll Audio Analyzer 5 eee a Bie _ OUTPUT 5 3 eio AUDIO IN High Multimeter _ INPUT Procedure 1 Set the digital multimeter to measure ac volts 2 On the Test Set a b Press Preset Select the AF ANALYZER screen Setthe AF Infield to Audio In Set the Filter 2 field to gt 99kHz LPF Select the SCOPE screen Set the Controls field to Marker and move the cursor to the Marker To Peakt field 3 Set the audio
125. ecall register press the Save key Namethe register SINAD Chapter 4 115 NOTE NOTE Functional Verification Wideband Sweep Wideband Sweep Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set This functional performance test requires the spectrum analyzer option in the Test Set Wideband sweep configures the Test Set to test all of its major functions problem located in the RF source or RF analyzer paths will become evident In this configuration the spectrum analyzer and tracking generator will be used totest and view the RF level and flatness of the RF source and RF analyzer over a 1 GHz span 1 Begin by using the same setup as analog loopback Recall SINAD register 2 Connect a short RF cable between the RF IN OUT port and theANTENNA IN port 3 Configure the instrument for wideband sweep mode 3a Press the Spectrum analyzer key On the SPECTRUM ANALYZER screen set the following fields e Set the Ref Level to 0 dBm Set the Span fieldto1 GHz FW rev A 02 XX and below 200 MHz FW rev A 04 5X and above 3b On the SPECTRUM ANALYZER RF Gen screen set the following fields Set the Controls field to RF Gen Track e Set the Port Sweep field to RF Out 4 Sweep should be Continuous across the disp
126. ed on the results of the diagnostics you should verify the diagnostics by other means if possible This could include using manual troubleshooting procedures and descriptions of the AF RF and CDMA diagnostics in this chapter and or block diagrams in Chapter 8 Block Diagrams on page 249 If you still lack confidence in troubleshooting or diagnosing the problem or faulty assembly call the Agilent Call Center 1 800 922 8920 for troubleshooting assistance CDMA Diagnostics Screen TESTS IBRSIC Controller wass SERVICE MENU NENNEN Move pointer to the desired program using the knob then press the knob Press Help for information on the tests Press Exit to abort a gt Functional Diagnostics AF Diagnostics RF Diagnostics COMA Diagnostics Edit Diagnostic Limits Periodic Calibration 10 Calibration IQ Demod Path Calibration Exit TESTS IBRSIC Controller F cF Move the pointer to the desired test using the knob then press the knob Press Menu to 30 to the Service Menus Exit to abort Run at room temperature after 15 minute warmup CDMA Diagnostics All COMA Tests COMA Reference Test Analog Cell Site Test 19 Modulator Test LOVIF Demodulator Test serv Menu Run the Functional RFs and Audio Freauency Diagnostics first Exit 67 Troubleshooting Frequently Encountered Diagnostic Messages Frequently Encountered Diagnostic M
127. edure see RF Generator FM Accuracy Performance Test 2 on page 149 Table 7 2 RF Generator FM Accuracy Test 2 Record RF Deviation Rate FM Deviation Limits kHz Revision MERO kriz Lower Upper Actual lt A 02 XX 30 99 1 95 035 102 965 lt A 02 XX 30 3 1 2 845 3 155 lt A 02 XX 312 5 3 1 2 845 3 155 lt A 02 XX 425 50 1 47 750 52 25 lt A 02 XX 501 99 1 95 035 102 965 lt A 02 XX 501 50 1 47 750 52 25 lt A 02 XX 501 3 1 2 845 3 155 lt A 02 XX 568 75 50 1 47 750 52 25 lt A 02 XX 656 25 99 1 95 035 102 965 lt A 02 XX 656 25 50 1 47 750 52 25 lt A 02 XX 656 25 3 1 2 845 3 155 lt A 02 XX 750 99 1 95 035 102 965 lt A 02 XX 750 50 1 47 750 52 25 lt A 02 XX 750 3 1 2 845 3 155 ALL 856 25 99 1 95 035 102 965 ALL 856 25 50 1 47 750 52 25 ALL 856 25 3 1 2 845 3 155 ALL 956 25 50 1 47 750 52 25 ALL 976 002 3 1 2 845 3 155 ALL 1000 99 1 95 035 102 965 ALL 1000 50 1 47 750 52 25 ALL 1000 11 1 10 115 11 885 204 siagilent e8285 ALR Book chapters perf_record fm Performance Test Records RF Generator FM Accuracy Performance Test 2 Record 2 RF Deviation Rate FM Deviation Limits kHz Revision Lower Upper Actual ALL 1000 3 1 2 845 3 155 The following entries are for the 2 GHz setup ALL 1700 99 1 95 035 102 965 ALL 1700 50 1 47 750 52 25 ALL 1700 3 1 2 845 3 155 ALL 2
128. eeloaaag e ooo 6 amp INPUT o9 AUDIO OUT On the audio analyzer a Reset the instrument b Select the 80 kHz low pass filter c Set the measurement mode to distortion On the Test Set a Press Preset b Select the RF GENERATOR screen c Setthe AFGen1 To and AFGen2 To fields to Audio Out On the Test Set for Audio Frequency Generator 1 do the following a Setthe AFGen2 To level field to O f b Set audio frequency and level as shown in the Performance Test Record PTR and measure the audio distortion Compare the measured distortion to the limits On the Test Set for Audio Frequency Generator 2 do the following Setthe AFGen1 To level field to and AFGen2 To level field to on b Setthe audio frequency and level as shown in the PTR and measure the audio distortion Compare the measured distortion to the limits 169 Performance Tests AF Generator Frequency Accuracy Performance Test 11 AF Generator Frequency Accuracy Performance Test 11 The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 11 AF Generator Frequency Accuracy Test 11 Record on page 228 Frequency accuracy is measured directly with a frequency counter The counter must be able to resolve 0 005 at 20 Hz
129. el Accuracy Performance Test 25 Record For test procedure see Generator RF IN OUT Amplitude Level Accuracy Performance Test 25 on page 190 Table 7 25 CDMA Generator RF In Out Test 25 Record Measured Level Limits dBm Sector RF MHz Level dBm Lower Upper Actual A 881 52 20 50 21 75 19 25 881 52 25 49 26 74 24 24 881 52 20 50 21 75 19 25 881 52 25 49 26 74 24 24 1956 25 21 50 22 85 20 15 1956 25 26 49 27 84 25 14 B 1956 25 21 50 22 85 20 15 B 1956 25 26 49 27 84 25 14 243 Performance Test Records CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26 CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26 For test procedure see CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26 on page 192 Table 7 26 Table 7 27 CDMA Generator DUPLEX OUT Sector B Power Level Accuracy Test 26 Record CD Measured Level Limits dBm Level dBm Lower Upper Actual 840 10 50 11 75 9 25 840 15 49 16 74 1424 1890 52 11 50 12 85 10 15 1890 52 16 49 17 84 15 14 Generator DUPLEX OUT AWGN Power Level Accuracy Test 26 Record RF Freq Measured Level Limits dBm Lower Upper Actual 840 7 50 9 25 5 75 840 9 10 75 7 25
130. enerator Section RF Generator SEO uiua ds eth Roa o REDE Co dup CR CR Reference Regulator Section rietriment Control Sect loue osos dcs hee ea GPIB SEIE CORR 9 Service Screen Troubleshooting with the SERVICE Screen NOTE Introduction This manual explains how to repair and calibrate the Agilent Technologies E8285A CDMA PCS Mobile Station Test Set called the Test Set throughout this manual Throughout this manual you will see this note Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set The purpose of this note is to bring attention to RF frequency band coverage provided by firmware revision A 04 5X and above Test Sets with firmware revision A 02 XX and below can operate at RF frequencies from 100 usable to 30 MHz to 1000 and 1700 to 2000 MHz 25 Introduction Test Set Description Test Set Description Several analog and digital test instruments are integrated into the E8285A CDMA Mobile Station Test Set to test Code Division Multiple Access CDMA digital cellular PCS and several types of analog mobile phones such as AMPS NAMPS and TACS Figure 1 1 The 8285 CDMA Mobile Station Test Set
131. ent on pin 3 of J12 This is the reference signal from the Reference assembly If the 1 MHz signal is not present then the Reference assembly is probably faulty It is also possible that an open or shorted trace on the Motherboard assembly exists Check the motherboard for continuity between J12 pin 3 under the Signal Generator Synthesizer assembly and J34 pin 1 under the Reference assembly and verify that the trace is not shorted to ground 73 Troubleshooting Manual Troubleshooting Procedures Swapping Known Good Assemblies Most swapped assemblies which use calibration data will operate well enough with the original assembly s calibration data to troubleshoot and to run the diagnostics do not expect the Test Set to meet its specifications Some assemblies may appear to fail because of incorrect calibration data It is also important to keep track of the original assemblies in the Test Set If calibration data is lost the assembly will have to be sent back to the factory Calibration data is generally stored in a daughter board s socketed EEPROM on the digital controller assembly If the controller is replaced or swapped the original EEPROM must be put in the new Test Set s controller Should the EEPROM lose its data the entire instrument will require factory restoration The assemblies that require downloaded calibration data from a memory card are Spectrum Analyzer optional Measurement Swapping these assembli
132. equired to key in the readings If the readings are within range the two values are automatically downloaded For the Test Set to meet published specifications the external DC voltmeter must be 0 015 accurate when measuring 5 V The voltmeter is connected to the test points on the Measurement board assembly see figure 5 4 Figure 5 4 Measurement Assembly Test Points SGND Measurement Board Assembly REF REF a2a33_1 eps Audio Frequency Generator Gain The gain of the following paths is calibrated The internal paths that run from Audio Frequency Generators 1 and 2 individually through the Modulation Distribution assembly to the monitor select output then onto Audio Analyzer 1 to the DVM The paths that run from Audio Frequency Generators 1 and 2 individually through the Modulation Distribution assembly to the AUDIO OUT connector externally to the rear panel MODULATION IN connector then again through the Modulation Distribution assembly to the monitor select output and to the DVM The above measured levels are used to adjust the output level of the audio generators so that they produce a calibrated level to the modulation inputs of the RF generator These measurements are made at DC Both positive and negative levels are measured to produce an optimum calibration factor 133 Periodic Adjustments Calibration Periodic Calibration Menu Descriptions External Modulation Path Gain The Audio Fre
133. er s guide for information on using the IBASI C computer also referred to as the BASIC controller 27 Introduction Product Description Product Description 8285 CDMA Mobile Test Set is designed to meet the needs of Cellular Provider Point of Sale Retailers manufacturing customers and other customers who require CDMA Mobile Phone test capability Test Set is very similar to it s predecessor the Agilent Technologies 8924 with the addition of newly designed RF 1 module upconverter and downconverter assemblies These assemblies extend the Test Set frequency range to cover the 1800 1900 MHz PCS Cellular band as well as providing standard 800 MHz cellular band coverage Internal Operating System A Motorola 68020 33 MHz microprocessor acts as the host processor of the Test Set It receives commands from the front panel controls and communicates directly with almost every assembly inside the Test Set The host is also in constant communication with several other mi croprocessors located throughout the Test Set Communications to the GPIB serial and parallel ports are through the control interface assembly to the host processor This processor is alsothe core for the internal IBASIC computer The IBASIC computer is used toload and run various software packages for automated radio tests It is also responsible for executing the internal diagnostic routines used to troubleshoot a failing instrument
134. es may cause some performance specification failures if the swapped in assembly s calibration data cannot be downloaded The assemblies that require on board calibration loaded at the factory are Downconverter Upconverter RFI O Output Section Receiver Signal Generator Synthesizer Receiver Synthesizer Reference Swapping these assemblies should not cause a performance problem as their calibration data resides with the assembly The assemblies that require a periodic calibration procedure are CDMA Reference RFInput Output LOIF IQ Modulator Audio Analyzer 1 Audio Analyzer 2 Measurement Modulation Distribution Generally these assemblies can be swapped without an immediate need of recalibration In some cases though a recalibration may be necessary to properly troubleshoot the instrument 74 SNagilente8285ALR Book chapterstrouble fm Troubleshooting Manual Troubleshooting Procedures Further Isolating RF Failures NOTE Figure 2 19 RF IN OUT DUPLEX OUT Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set Isolating failures in the RF assemblies of the Test Set can be difficult One problem occurs when the diagnostics use the built in RF analyzer to test the built in RF source and vice ver
135. essages Warning Error Messages NOTE Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set Error messages that appear on the second line of the Test Set s display frequently occur while any of the SERVICE7 program diagnostic tests are running The most complete and general list of error messages is in the Error Messages chapter of the Test Set s Reference Guide Some messages relating specifically to troubleshooting can be found in Chapter 10 Error Messages on page 291 Some of the messages you can expect to occur while running the SERVICE7 program diagnostic tests are as follows Direct latch write occurred Cycle power when done servicing The SERVICE7 program commonly generates this message This message appears the first time the diagnostic program directly addresses a latch The message should be ignored and cleared when you make a normal not a diagnostic measurement with the Test Set To clear this message the Test Set should be turned off and back on again Change Ref Level Input Port or Attenuator if using Hold This message and similar messages can be generally ignored Printer does not respond This usually indicates that one or more settings on the TESTS Printer Setup screen are set incorrectly for your printer Also check tha
136. et to 127 before starting the calibration adjustment and the calibration is carried out at several equally spaced frequencies between 800 and 1000 MHz The instrument is set into a CDMA loopback mode and the calibration is carried out by first adjusting the I and Q dc offset DACs while monitoring the carrier feedthrough CFT Both CFT and rho are measured by the Receive DSP Once the CFT is minimized through an iterative process the signal delta and the quad DACS are adjusted while monitoring rho When rho is maximized again through an iterative process the calibration adjustment is complete At power down each DAC setting at each frequency is downloaded to the calibration ROM on the Controller assembly 137 Periodic Adjustments Calibration IQ Calibration Program Description Figure 5 6 IQ Calibration TESTS Main Menu SERVICE LORD TEST PROCEDURE Select Procedure Location R Select Procedure Filename Library E ICE NO LIB Description Launches diagnostic ar CUSTOMIZE TEST PROCEDL WEE Channel Informati ea Test Parameters Order of Tests Pass Fail Limits Sove Delete Proce 138 siagilent es285 ALR Book chapters period_adj fm gt Functional Diagnostics AF Diagnostics RF Diagnostics COMA Diagnostics Edit Diagnostic Limits Periodic Calibration IQ Calibration IQ Denod Path Calibration Continue s Program ROM SERVICE MENU Move
137. firmware revision displayed at the top of the screen when the Test Set is powered up and is also displayed on the CONFIGURE screen Telephone Numbers and E mail 1 800 922 8920 Agilent Technologies Call Center 1 800 827 3848 Spokane Division Service Assistance U S only 1 509 921 3848 Spokane Division Service Assistance nternational 1 800 227 8164 Agilent Technologies Direct Parts Ordering U S only 1 916 783 0804 Agilent Technologies Service Parts Identification U S amp International 1 800 403 0801 Agilent Technologies I nstrument Support Center e Email spokane service agilent com Downloading Calibration Data Most assemblies in the Test Set require calibration data To ensure that the Test Set remains calibrated after an assembly is replaced new calibration data must be downloaded When required calibration data is provided on a PCMCIA memory card that is included with the replacement assembly Refer to Table 2 2 Relating Assemblies to Troubleshooting Aids on page 70 of Chapter 2 Troubleshooting to see which modules require calibration 85 Disassembly and Replaceable Parts Before You Start Calibration Data Download Procedure 1 Switch the Test Set s power off 2 Remove the faulty assembly 3 Install the replacement assembly 4 Switch the Test Set s power on B 6 7 8 9 Insert the memory card Press the Tests key Setthe Select Procedure Location field
138. for the 2 GHz setup ALL 201 5 1700 14 ALL 501 5 2000 14 209 Performance Test Records RF Generator Level Accuracy Performance Test 5 Record RF Generator Level Accuracy Performance Test 5 Record For test procedure see RF Generator Level Accuracy Performance Test 5 on page 158 Table 7 5 RF Generator Level Accuracy Test 5 Record E 9 Level Level Limits dBm Revision Lower Upper Actual The following entries are for Procedure 1 lt A 02 XX DUPLEX OUT 30 11 12 10 lt A 02 XX DUPLEX OUT 30 16 17 15 lt 02 DUPLEX OUT 30 21 22 20 lt 02 DUPLEX OUT 30 26 27 25 lt A 02 XX DUPLEX OUT 30 31 32 30 lt A 02 XX DUPLEX OUT 30 36 37 35 lt 02 DUPLEX OUT 30 41 42 40 lt 02 DUPLEX OUT 30 46 47 45 lt 02 DUPLEX OUT 30 51 52 50 lt A 02 XX DUPLEX OUT 30 56 57 55 lt A 02 XX DUPLEX OUT 30 61 62 60 lt A 02 XX DUPLEX OUT 30 66 67 65 lt A 02 XX DUPLEX OUT 30 71 72 70 lt A 02 XX DUPLEX OUT 30 16 77 75 lt A 02 XX DUPLEX OUT 30 81 82 80 lt 02 DUPLEX OUT 30 86 87 85 lt 02 DUPLEX OUT 30 91 92 90 A 02 XX DUPLEX OUT 30 96 97 95 lt 02 DUPLEX OUT 30 101 102 100 lt 02 DUPLEX OUT 30 106 107 105 lt 02 DUPLEX OUT 30 111 112 110 lt A 02 X
139. formance Test 20 on page 180 page 238 RF Analyzer FM Distortion Performance Test 21 on page 182 page 239 RF Analyzer FM Bandwidth Performance Test 22 on page 184 page 240 RF Analyzer Residual FM Performance Test 23 on page 186 page 241 Spectrum Analyzer Image Rejection Performance Test 24 on page 188 page 242 CDMA Generator RF IN OUT Amplitude Level Accuracy Performance Test 25 on page page 243 190 CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26 on page 244 page 192 144 S agilent e8285 ALR Book chapters perf_test fm Performance Tests Procedure and Equipment Test Record in Performance Tests Chapter 7 in this chapter Performance Test Records CDMA Generator Modulation Accuracy Performance Test 27 on page 194 page 245 CDMA Analyzer Average Power Level Accuracy Performance Test 28 on page 196 page 246 CDMA Analyzer Channel Power Level Accuracy Performance Test 29 on page 198 page 247 145 Performance Tests RF Generator FM Distortion Performance Test 1 RF Generator FM Distortion Performance Test 1 NOTE Initial Setup Figure 6 1 Figure 6 2 The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 1 RF Generator FM Distortion Test 1 Record on page 202 The FM distortion of the RF generator is measured directly by the measuring receiver The Test Set s in
140. frequency 27 3 Special Key in the LO frequency in MHz which is 1500 MHz On the Test Set for frequencies of 1700 and 2000 MHz continue on as in step 2 157 Performance Tests RF Generator Level Accuracy Performance Test 5 RF Generator Level Accuracy Performance Test 5 The purpose of this test is to verify that the Test Set meets the specification limits in Performance Test Record table 7 5 RF Generator Level Accuracy Test 5 Record on page 210 Using a measuring receiver and sensor module at several frequencies up to 1 GHz the Test Set is set to generate levels between 10 and 125 dBm in 5 dB steps at it s DUPLEX OUT connector The level is measured with the tuned RF level function of the measuring receiver At each frequency the measuring receiver connection is moved to the RF IN OUT and the level measured from 40 to 125 dBm As the test proceeds you may be required to recalibrate the measuring receiver To extend the measurement frequency to 2 GHz the second method uses a microwave converter and amplifier to extend the measurement range see figure 6 10 on page 160 Setup 1 Figure 6 9 Setup 1 for Measurements to 1 GHz Ges llraeele88B8lo gee ece Seoloosjeo Measuring Receiver Hfeeelfoo00 e O 155 a SENSOR DIEE RF IN OUT DUPLEX OUT INPUT 500 Sensor Module
141. ge 254 271 Block Diagrams CDMA Analyzer Section 1Q Modulator Figure 8 15 ZdSa 01 454 01 JN Sf ZXNW 8M DI 0379005 20 1007130 JU8S W3W 01 OL 8M Ol AN Tr 2 Z lt DOTWNV vias JILSOND VIG d 221 QNV8 W 1 3116 7735 4 QNV8 3sva N 333 135440 0 DO VNV 315 71142 QNV8 3asva YOLV INGOW 0 A 130 4 100 dd 136440 2 m SHnivsavno 3svHd 4 ZHW 000 005 HINAS N39 915 bd YOLVINGOW 272 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams CDMA Analyzer Section LO IF Demodulator Figure 8 16 SV3A OL JYES WAW 01 2 8 LOSI OL 0532 01 1 5 em 4349 2 799674 uolvug3INI 388 basa 01 ZHWOL 43413934 WNV 934 01 Gowa3a 4 01 273 Block Diagrams CDMA Analyzer Section Figure 8 17 Digital Signal Processor 1 DSP 1 DSP IQ WB MUX1 FROM MOD IF_DSP1 FROM LO IF DEMOD FSI FROM CDMA REF FROM CDMA REF AMB_DSP_TRIG FROM AMB LITE HOST GATED BUS DSP_TRIG_IN RP 274 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams CDMA Generator Section CDMA Generator Section Data Generation
142. gure 6 1 and figure 6 2 on page 146 1 On the measuring receiver o P Reset the instrument Set the high pass filter to 300 Hz Set the low pass filter to 3 kHz Set the measurement mode to FM Set the measurement mode to audio distortion If the microwave converter is being used set the frequency offset mode to exit the mode 27 0 Special 2 On the Test Set 1 Press Preset Select the CONFIGURE screen Set the RF Display field to Freq Set the RF Offset to Off Set the Output Port field to Dupl Select the RF GENERATOR screen Set the RF Gen Freq field to the appropriate RF frequency based on the firmware revision see NOTE above from the Performance Test Record Set the Amplitude to 10 dBm Set AFGen1 To field to FMat 99 kHz deviation 3 For frequencies up to 1000 MHz measure the FM distortion audio distortion at the RF frequencies and deviations shown in the Performance Test Record PTR and compare the measured distortion to the limits The following steps are for measurements to 2 GHz 4 On the signal generator a b Set the frequency to 1500 MHz CW Set the level to 8 dBm or whatever level is suitable for the microwave converter s LO input 147 Performance Tests RF Generator FM Distortion Performance Test 1 5 On the measuring receiver a Set the frequency offset mode to enter and enable the LO frequency 27 3 Special b
143. he Tests Main Menu select the Run Test field or press and wait for the SERVICE MENU to appear see figure 2 13 on page 61 7 Choose the diagnostic test Functional AF RF or CDMA to run by turning the knob to move the pointer and then pressing the knob to select the test 8 Follow the instructions on the screen 58 S agilent e8285 ALR Book chapters trouble fm Figure 2 11 Troubleshooting Functional Diagnostics As some of the tests run you may be offered the options to alter test execution conditions by selecting Loop to run the test continuously Pause to pause the tests Stp Fail stop failure to stop on a failure Sgl Step single step to pause the test after each measurement For descriptions of the diagnostic options refer to Functional Diagnostics Menu on page 62 AF Diagnostics on page 64 RF Diagnostics on page 65 CDMA Diagnostics on page 67 Define Test Conditions 1 On TESTS Main Menu screen see figure 2 13 select Exec Execution Cond to access the TESTS Execution Conditions screen TESTS Execution Conditions TESTS Execution Conditions Run Test utput Results To Qutput Results For racontinue All Foiluresi Output Heading Test Procedure Run Mode fain Menu Continuous Single Step Autostart Test Procedure on Power Up 011701 2 Set up the Output Results To field Select Crt to view measurements only on the di
144. heir factory power up configuration If you have saved one or more instrument setups using the SAVE function using this function will permanently remove them 297 Service Screen Troubleshooting with the SERVICE Screen 298 s agilent e8285 ALR Book chapters service_scrn fm Index A AC Level Accuracy AF Analyzer performance test 171 AC Level Accuracy AF Generator performance test 167 adjustments See periodic adjustments AF Diagnostics See diagnostics Amplitude Accuracy Oscilloscope performance test 177 Amplitude Level Accuracy DUPLEX OUT CDMA Generator performance test 192 Amplitude Level Accuracy RF IN OUT CDMA Generator performance test 190 Analog Cellsite assembly 33 Analog Cellsite assembly block diagram 261 Analog Loopback verification test 114 ANTENNA IN connector 30 assemblies locating 89 top side 89 AUD MONITOR OUTPUT connector 31 Audio Analyzer 1 assembly 31 Audio Analyzer 1 Offset adjustment 134 Audio F requency Generator Gain adjustment 133 AUDIO IN connector 31 Average Power Level Accuracy CDMA Analyzer performance test 196 battery replacement 92 battery Memory assembly 92 battery Regulator assembly 92 block diagrams 251 Boot Code 91 Boot ROM replacement 91 calibration overview 38 calibration See periodic adjustments calibration data 91 downloading 85 how to recover 74 126 loss of 74 126 storage location
145. herefore the mobile phone functional test may not be successful if this information is not known 2a Press CDMA SCREENS Cell config key On the CDMA CELL SITE CONFIGURATION screen For the System ID field if known enter system ID number For theRgstr SID field enter system ID number same as System ID field Set the Pwr Up Reg field to on 2b Press the Config key and set the Date field for one month in advance 2c Press the CDMA SCREENS Call control key e Place cursor on the Avg Power field and select Chan Power e For the RF Chan Std field enter appropriate RF channel standard For the Protocol field select appropriate protocol e For the RF Channel field enter appropriate RF channel For the Traffic Data Mode field Select Svc Opt 2 e For the sctr A Pwr field enter 55 dBm BW Suggestion Store instrument settings as a Save Recall register press the Save key Name the register CP 3 Turn mobile phone on Ensure Test Set s Call Status Transmitting annunciator is lit Mobile should obtain service with the Test Set f capable mobile will do a power up registration within 20 seconds indicated by the ESN appearing below the MS Database field Mobile RSSI indicator shows four bars Mobile may display date and time setting of Test Set 4 Originate Call Dial 123 on mobilethen press YES or Send Test Set s Connected annunciator should be lit Mobile should bein a connected Svc O
146. iation read on the Test Set in the Performance Test Record and compare it to the limits 187 Performance Tests Spectrum Analyzer Image Rejection Performance Test 24 Spectrum Analyzer Image Rejection Performance Test 24 Setup Figure 6 29 Procedure 188 The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 24 Spectrum Analyzer Image Rejection Image Test 24 Record on page 242 The first procedure measures the spectrum analyzer s ability to reject image frequencies The spectrum analyzer is tuned to a signal frequency while an image signal from the signal generator is applied to the antenna input port Spectrum Analyzer Image Rejection Test 24 d 3 5 sss s 5 5 5905 8888 o008 s olB8956 20 9e Signal Generator ANTENNA IN OUTPUT Back 10 MHz OUTPUT On the signal generator a Set the level to 20 dBm b Set the frequency to 1229 MHz c Set modulation off 2 On the Test Set a Press Preset b Select the CONFIGURE screen c Setthe RF Display field to Freq d Select the SPEC ANL screen S agilent e8285 ALR Book chapters perf_test fm Bm i 1 Performance Tests Spectrum Analyzer Image Rejection Performance Tes
147. ield above The latches control switch DAC and gain settings within the Test Set The value of the selected latch is displayed and changed in the Value field Some settings are read only To set a latch 1 Use the knob to select the Module A Choices menu will appear Move the cursor to the desired module name and press the knob to select it Use the knob to select the latch field A Choices menu will appear 2 3 4 Move the cursor to the desired latch name and press the knob to select it 5 Use the knob to select the Value field A flashing gt gt cursor is displayed 6 Rotate the cursor control knob or key in a number on the keypad to modify the value hexadecimal Value hex This field displays and changes the hexadecimal value for the latch shown in the Latch field RAM Initialize Selecting this field clears all SAVE registers and test programs and any initialized RAM disk s that may be in RAM It also resets all latches to their factory power up configuration If you have saved one or more instrument setups using the SAVE function using this function will permanently remove them 81 Troubleshooting Service Screen Disassembly and Replaceable Parts This chapter contains information for the removal and replacement of the assemblies in the Test Set Illustrations and a parts list are provided for parts identification 83 Disassembly and Replaceable Parts Before You Start Before
148. ime field 80 Latch field 81 RAM Initialize field 81 Value hex field 81 Voltmeter Connection field 79 Service Screen 294 accessing 294 SERVICE7 diagnostics loading 58 menu 61 See Also diagnostics 1Q calibration accessing 130 loading 130 periodic calibration accessing 130 loading 130 Signal Generator Synthesizer assembly 33 troubleshooting 73 Signaling Source Analyzer assembly 31 Signaling Source and Analyzer A15 31 SINAD Accuracy AF Analyzer performance test 173 speaker internal 31 Spectrum Analyzer assembly 32 Spurious Spectral Purity RF Generator performance test 165 Swapping assemblies 74 SYSPWRO program accessing 39 loading 39 part number 39 T test equipment for performance tests 142 overview for adjustments 128 test points power supply 50 voltmeter reference 133 test record 201 247 test record functional verification 123 test set description 26 theory of operation 28 audio analyzer 266 audio generator 277 CDMA analyzer 271 CDMA generator 275 digital control 287 display 287 oscilloscope 266 power supply 284 reference 284 RF generator 279 spectrum analyzer 256 timebase DACs 135 Timebase Reference Using a Counter adjustment 132 Timebase Reference Using a Source adjustment 132 time outs 69 tools 84 See Also equipment top side assemblies 89 torque settings connectors 84 troubleshooting assembly swap 74 calibration data 74 flow chart 47
149. ing assemblies Audio Analyzer 2 Audio Analyzer 1 Modulation Distribution Signaling Source Analyzer AF Generators 1 and 2 only Measurement only a few selected inputs After initial cabling all tests can be run in a loop mode without further intervention This makes it easier to catch intermittent failures To run the AF diagnostics see Accessing the Diagnostic Tests on page 58 A fifteen minute warm up is required The measurement limits of the SERVICE7 diagnostic tests are valid only at room temperature that is 20 to 25 C 65 to 75 F 64 S3agilente8285ALR Book chaptersrouble fm Figure 2 15 RF Diagnostics Troubleshooting AF RF and CDMA Diagnostics AF Diagnostics Screen TESTS IBRSIC Controller SERVICE MENU s Move pointer to the desired program using the knob then press the knob Press Help for information on the tests Press Exit to abort ____ gt Functional Diagnostics AF Diagnostics RF Diagnostics COMA Diagnostics Edit Diagnostic Limits Periodic Calibration IG Calibration I8 Denod Path Calib TESTS IBASIC Controller W__ w Move the pointer to the desired test using the 2 knob then press the knob Press Serv Menu to go to the Service Menus Exit to abort gt All Audio Tests 1 Audio Freauency Generators 1 and 2 Audio Diagnostics Preliminary Audio Paths Mod Distribution Internal Paths Mod Distribution External Paths
150. io Generator Section Audio Generator Section Waveform Generation The Signal Source and Analyzer see figure 8 19 on page 277 gets frequency and wave shape information from the Controller Waveform values are calculated real time by a digital waveform synthesis IC The LFS1 output is always a sine wave TheLFS2 output is a sine wave unless one of the function generator waveforms is selected or signaling is selected from the front panel Level Control Audio level is controlled by the Modulation Distribution assembly see figure 8 20 on page 278 by using a DAC and variable attenuators The leveled audio signal is passed on to the RF Generator section Figure 8 19 Signaling and Analyzer Assembly SIG SOURCE GATED BUS H 1 4 TRIGGER FILTERS 277 Block Diagrams Audio Generator Section Modulation Distribution Figure 8 20 01 yas v 8 8 2 2 Ma 100 any ven 21541 39410 918 Wou3 Tas NOW QQN5 VONO TZ 104100 2541 Eb bd woud 287 1 1 Gow Q1 25 1 1no ADI 0 da 100 ONY 2 3 20 2 10d ZLNO GNV MTE 14100 06 DIS WOU N39 915 Wa 350 0 Ol 100 OQ misa udis GOW anv 0 0009 di NOLL23S lt O
151. irmware dBm MHz kHz dB KHz dB Revision kHz Lower Upper Reading Computed ALL 10 2000 50 0 2 1 1 ALL 10 2000 50 2 1 1 ALL 10 2000 50 10 1 1 ALL 10 2000 50 25 1 1 207 Performance Test Records RF Generator Residual FM Performance Test 4 Record RF Generator Residual FM Performance Test 4 Record For test procedure see RF Generator Residual FM Performance Test 4 on page 155 Table 7 4 RF Generator Residual FM Test 4 Record LO RF Residual FM Limits Hz Revision ME ME Upper Actual lt A 02 XX 31 5 30 7 lt A 02 XX 101 5 100 7 lt A 02 XX 249 5 248 7 lt A 02 XX 251 5 250 4 lt A 02 XX 401 5 400 4 lt A 02 XX 501 5 500 4 lt A 02 XX 502 5 501 7 lt A 02 XX 512 701 511 201 7 lt A 02 XX 513 101 511 601 7 lt A 02 XX 513 501 512 001 7 lt A 02 XX 626 5 625 7 lt A 02 XX 736 5 735 7 lt A 02 XX 741 5 740 7 lt A 02 XX 746 5 745 7 lt A 02 XX 751 5 750 7 lt A 02 XX 769 501 768 001 7 ALL 846 5 845 7 ALL 851 5 850 7 ALL 856 5 855 7 ALL 866 5 865 7 ALL 901 5 900 7 ALL 999 901 998 401 7 208 S agilent e8285 ALR Book chapters perf_record fm Performance Test Records RF Generator Residual FM Performance Test 4 Record E Mn LO RF Residual FM Limits Hz Revision Upper Actual ALL 1001 5 1000 7 The following entries are
152. isassembly and Replaceable Parts Disassembly Procedures Downconverter Assembly this assembly disconnect the cables connectors and 4 screws shown in Figure 3 10 Figure 3 10 Downconverter Removal lt RBN_20CNDCT_28AWG 26 CX_F_SMB SMB 170 CX_F_SMB SMB 530 DNCONV_KIT SR_3 58_SMA SMA 25 downcnvrtr disassembly eps Upconverter Assembly Toremovethis assembly disconnect the cables connectors and 4 screws shown in Figure 3 11 Figure 3 11 Upconverter Removal RBN 20CNDCT 28AWG 40 SR 2 18 SMA SMA 28 SMM4 0 16SEMPNTX Qty 4 SR_2 18 SMA SMA 24 upcnvrtr disassembly eps 95 Disassembly and Replaceable Parts Disassembly Procedures RF I O and Coaxial Switch Assemblies Toremove the RF 1 or coaxial switch assembly or other associated components see Figure 3 12 Figure 3 12 RF I O and Coaxial Switch Assemblies Removal CX_F_SMB SMB 530 5 4 0 105 Qty 4 RBN_20CNDCT_28AWG 26 SR 3 58 SMA SMA 25 SR 3 58 SMA SMA 17 SR 3 58 SMA SMA 16 RF IO KIT BRACKET RFI O SMM3 0 18 PN TX 2 TERMINATION SR_2 18 SMA SMA 24 NOTE 1 SR 3 58 SMA SMA 22 SMM4 0 10SEMPNTX Qty 4 BRACKET RELAY SR 3 58 SMA SMA 15 disassembly eps NOTE 1 To remove this cable it is necessary to loosen the coaxial switch 96 S3agilente8285 ALRBook chapters disassem
153. ital functions are tested The outcome of the test appears on the display if operating and on four LEDs viewable and the digital controller board you must remove the external and top internal covers to view the LEDs The self test diagnostic can be run three ways 1 The test runs automatically when the Test Set is turned on After the Test Set powers up a message appears at the top of the display If one or more tests fail the message reports the failure with a hexadecimal code During the test coded failure information is displayed on four LEDs on the top of the controller board see figure 2 1 on page 46 The Test Set s cover must be removed to view these LEDs See Chapter 3 Disassembly and Replaceable Parts on page 83 for disassembly and replacement instructions 2 The test runs when the Test Set receives the query TST over GPIB The resultant decimal code can be read over the bus 3 The test runs when the Self Test menu item of the Functional Diagnostics menu is selected To Start Troubleshooting NOTE Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set 1 Turn on the Test Set to automatically run the self test diagnostics Ifthe Test Set does not power up see If the Test Set Fails to Power up on page 49 fall self test diagnos
154. l diagnostics To read the LED codes the Test Set s cover must be removed If the Test Set has no faults that can be detected by the Self Test Diagnostic the four LEDs on the Controller assembly will light and remain on for about ten seconds During that period a short beep will be heard Then the LEDs will extinguish and remain off If a fault is detected during the test 1 The four LEDs will go on for about four seconds 2 The LEDs will blink a failure code which corresponds to the error listed in table 2 1 Return Values for Self Test Diagnostic Failures on page 52 Figure 2 7 First LED Patterns on page 55 shows the blinking LED codes 3 Two non blinking LED codes will follow The interpretation of these codes depends on the preceding blinking code Two sets of the non blinking codes are listed see figure 2 8 Non blinking LED Codes For Serial Bus Communication Failure on page 56 and figure 2 9 Non Blinking LED Codes for Miscellaneous Hardware Failure on page 57 4 If there is more than one failure the test will loop back to step 2 and repeat until the last failure is reported The pattern generated by the LEDs can be interpreted as a binary weighting code The LED labeled 0 is the least significant bit see figure 2 6 on page 54 For example if the LEDs blinking pattern is Off On On On reading left to right or LEDs 3 2 1 0 the binary number is 0111 or decimal 7 The error codes shown in table 2 1
155. l meet its power measurement accuracy specifications after repair An RF signal generator and a power splitter produce two signals with the same power level One signal is measured by the power meter the other is applied to the input of the Test Set The program measures these levels at selected frequencies and then generates calibration factors so the Test Set readings match the power readings These calibration factors are stored in the Test Set Communication between the active instrument s is through the Test Set s GPIB port An optional printer can be connected tothe Test Set s GPIB serial or parallel port Typically this is done from the Printer Setup field of the SOFTWARE menu screen To run the System Power Calibration program 1 Connect GPIB cables from the Test Set to the signal generator and power meter 2 Insert the PCMCIA Memory Card p n E6380 61811 into the Test Set s memory card slot Press the Tests key to access the TESTS Main Menu screen Select the field under Select Procedure Location Select Card under the Choices menu Select the field under Select Procedure Filename Select SYSPWRO Select Run Test K1 key Follow the instructions on the screen 39 Introduction Test Equipment Needed for the System Power Calibration Program Test Equipment Needed for the System Power Calibration Program For the System Power Calibration program you will need the equipment
156. lay with no RF level dropouts Fairly flat about 4 to 5 dB difference between end points 5 Record results in the Table 4 1 on page 123 SUGGESTION Store instrument settings as a Save Recall register press the Save key Name the register WB SWEEP 116 S agilent e8285 ALR Book chapters verif fm NOTE Functional Verification Channel Power Loopback Verification Test Channel Power Loopback Verification Test Channel power is extremely important in the ability of the Test Set to maintain a link with and properly control power output levels of the mobile phoneunder test Channel power loopback verification is a quick way to ensure that both the average and channel power measurements are working properly 1 Press the green Preset key to configure instrument to default settings 2 Connect a short RF cable between the RF IN OUT port and DUPLEX OUT port 3 Configurethe Test Set for channel power loopback mode this is a non standard user mode 3a Press the CDMA SCREENS Call control key and set the RF Chan Std field tous PCS 3b Press the Config key and set the following fields RF Display Freq RF Offset On Gen Anl 0 MHz Output Port Dupl Input Port RF In Press the CDMA SCREENS Call control key On the CALL CONTROL screen set the following fields RF Gen Freq 1900 MHz Place cursor on the Avg Power field and select Chan Power Placecursor on the Power Meas field
157. libration requirements see table 5 1 Assembly Calibration Information on page 127 126 sjagilent es285 ALR Book chapters period_adj fm Table 5 1 Periodic Adjustments Calibration Periodic Adjustments Assembly Calibration Information Calibration Data Location Calibration Program Assembly Memory Sub Program on Assembly Card Audio Analyzer 1 Periodic Calibration Audio Analyzer 1 Offset Modulation Distribution Periodic Calibration External Modulation Path Gain and AF GEN Gain Upconverter X Output Section Signal Generator Synthesizer Reference X Periodic Calibration Timebase Reference Receiver Receiver Synthesizer Spectrum Analyzer X Downconverter X Measurement X Periodic Calibration Voltmeter References RF I O X See System Power Calibration Program on page 39 CDMA Reference IQ Calibration Controller X LO IF IQ Demodulator IQ Calibration and IQ Demod Path Calibration Digital Cellsite 1 or 2 IQ Calibration IQ Modulation IQ Calibration Analog Cellsite PCB Cal ROM based Audio Analyzer 2 Periodic Calibration Variable Frequency Notch Filter 127 Periodic Adjustments Calibration Periodic Adjustments Test Equipment Test Equipment for the Periodic Adjustments Programs Forthe Timebase Reference Using a Counter calibration you will need to connect a frequency counter to the rear panel 10 MHz REF OUTPUT connector The accuracy
158. ll of the modules and assemblies by the Power Supply Regulator assembly through the motherboard Power Supply The Power Supply assembly is a switching type supply The power supply generates five different dc supplies They are 45 5 e 413 4 Vdc e 13 4 Vdc 443 5 Vdc e 12 Vdc AUX Power Supply voltages are distributed to all of the modules and assemblies through the motherboard 284 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams Reference Regulator Section High Stability Reference Figure 8 24 4334 9S 01 NOIL23S LNdLNO YAIY Ol OL 01 2 ZHWOOS JYES WAW 334 100 ZHW OL a snrav 52 0 2 0 8 855 YMY 01 3NIS 2 lt gt XAY WOL ZHWOL 50 lt SundS 28P06 gt 100 S334 WOZ 51201 40 100 C 01 30 110 NI Sau 1x3 52 6l Ed OXOL ZHWOL isnrav Sova 2 12 24 39N3H343H 815 285 5 OL YSHLOW 501234402 z 01 Ir 5 b 5 5 5 l 5 lt e 2 2 2 5 3 lt hai lt lt 2 2 e 5 3 lt ps 5 gt lt 2 lt a z le 5 9 e ja 4 5 lt 2 w gt 5 r gt gt gt 2 lt 5 g
159. lt nang 4 GOW WY 02441 wy 123735 00 y p QN O 9 1 GOW NI 2I ZRLSHAZATYNY 8834 mo 9 A33 gt DR OE 2 230 40 01 Q lt 133135 Oldnv 01 NOILNGIMLSIG GOW id Eid 2170 agilent e8285 ALR Book chapters blockdiag fm 278 s Block Diagrams RF Generator Section RF Generator Section Frequency Generation NOTE Table 8 3 Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set The Signal Generator Synthesizer figure 8 21 on page 281 develops a 500 MHz to 1000 MHz signal which is phase locked to the 200 kHz reference from the Reference Assembly figure 8 24 on page 285 An out of lock indicator LED lights if the phase lock loop is out of lock When you turn the Test Set s power on the LED lights for a few seconds then goes out If it stays on or comes on again the loop is out of lock TheRF Output Section assembly figure 8 22 on page 282 develops the RF Generator s 30 to 2000 MHz frequency range by mixing dividing or passing the 500 MHz to 1000 MHz from the Signal Generator Synthesizer The frequencies are derived as shown in table 8 3 The U pconverter assembly
160. m ojo o NIoljujoljo TTP ttt Tttttttltit lt H H313A170A SH 5 N LLJ 13s X n W 75 d a 340 Wwu51d Je 2 1 0 ___ 2 5 25 aaa Q4vO8 LNAWSYNSVAW Sna sv3W 159 OND 62 N33S ZHWOZ 6 ZH 00Z 2485 SVAW 269 Block Diagrams Audio Analyzer Section Figure 8 14 Signaling and Analyzer Assembly SIG SOURCE 6 78MHz GATED_BUS SIGNALING SCOPE AUDIO P1 1 SCOPE TRIGGER FILTERS GND B D AGND 270 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams CDMA Analyzer Section CDMA Analyzer Section IF Conversion To downconvert the CDMA the signal the 114 3 MHz IF is mixed with a 110 6136 MHz LO to produce a 3 6864 MHz IF in the IQ Modulator assembly see figure 8 15 on page 272 The oscillator that produces the LO signal is phaselocked to a 10 MHz signal from the CDMA Reference assembly see figure 8 18 on page 276 CDMA Signal Analysis The 3 6864 MHz signal goes to the DSP assembly The DSP assembly analyzes the 3 6864 MHz signal to make Q modulation measurements such as rho timing accuracy carrier feedthrough and phase error Power Measurements The DSP assembly also makes average power measurements through direct link from the RF Input Output assembly figure 8 2 on pa
161. mance Test 23 RF Analyzer Residual FM Performance Test 23 The purpose of this test is to verify that the Test Set meets the specification limits in Performance Test Record table 7 23 RF Analyzer Residual FM Test 23 Record on page 241 The signal generator provides a CW signal with minimal residual FM The FM is measured by the Test Set s internal RF analyzer Setup Figure 6 28 Signal Generator CAC po 2100 88 00000 nal 20000 pal oooo 06060 0000 RF OUTPUT ANTENNA IN Procedure 1 On the signal generator a Set the output frequency to 840 MHz b Set the output amplitude to 0 0 dBm c Set the function to MOD OFF 2 On the Test Set Press Preset Select the CONFIGURE screen Set the RF Display field to Freq Select the RF ANALYZER screen Set the Tune Freqto 840 MHz Set the Input Port field to Ant Setthe IF Filter field to 230 kHz Select the AF ANALYZER screen Set the In field to Demod Setthe Filter 1 field to 300Hz HPF Setthe Filter 2 field to 3kHz LPF 1 Set the Detector field to RMS ro gt A P 186 S agilent e8285 ALR Book chapters perf_test fm Performance Tests RF Analyzer Residual FM Performance Test 23 3 Read the FM deviation residual FM for each both RF frequencies 840 and 1800 MHz and record the dev
162. mber tag located on the rear panel Installed options if any tag located on the rear panel nstrument firmware revision displayed at the top of the screen when the Test Set is powered up and is also displayed on the CONFIGURE screen Support Telephone Numbers 1 800 827 3848 RF Comms Service Assistance U S only 1 509 921 3848 RF Comms Service Assistance nternational 1 800 227 8164 Agilent Direct Parts Ordering U S only 1 800 403 0801 Agilent Instrument Support Center U S only 1 916 783 0804 Agilent Service Parts Identification U S amp Intl S agilent e8285 ALR Book chapters front fm Power Cables Table 3 Plug Descriptions Agilent Part Plug type eredi cable amp plug Cable Descriptions Straight Straight 8120 1689 79 inches mint gray Straight 90 8120 1692 79 inches mint gray Used in the following locations Bangladesh Belgium Benin Bolivia Boznia Herzegovina Bulgaria Burkina Faso Burma Burundi Byelarus Cameroon Canary Islands Central African Republic Chad Chile Comoros Congo Croatia Czech Republic Czechoslovakia Denmark Djibouti East Germany E gypt Estonia Ethiopia Finland France French Guiana French Indian Ocean Areas Gabon Gaza Strip Georgia Germany Gozo Greece Hungary Iceland Indonesia Iran Iraq Israel Italy Coast J ordan Kazakhstan K orea Kyrgystan Latvia
163. n Failure If the second and third LED Then the failure is 56 patterns displayed are 01 23 01 23 Modulation Distribution Output Section Xtit e e Xtit e e Audio Analyzer 1 exe eee Audio Analyzer 2 15160 Reference existe 217 RF Input Output Xt xt 3k xt 0 Downconverter ee ext ee ext Receiver Xt e 51 Yt e Spectrum Analyzer e xt e gt ext Signal Generator Synthesizer 55 e Xt e XE Receiver Synthesizer e e gt e gt Upconverter 15 e y x XL LO IF IQ Modulator Xr yt e 1030 CDMA Generator Reference e Digital Cellsite LED Legend off 355 rapid blink xt Steady on or slow blink S agilent e8285 ALR Book chapters trouble fm Troubleshooting Self Test Diagnostics Figure 2 9 Non Blinking LED Codes for Miscellaneous Hardware Failure If the second and third LED patterns displayed are Then the failure is 01 2 3 01 2 3 15 15 5 e 536 ee 9 9 LED Legend e off 396 rapid blink Xt steady on or slow blink don t care Reference Audio Filter 1 C Message Filter Audio Filter 2 6 kHz BPF Receive DSP Digital Cellsite 1 and 2 57 Troubleshooting Functional Diagnostics Functional Diagnostics The Diagnostics of the SERVICE7 MENU show
164. n in figure 2 13 on page 61 check whether or not major portions of the Test Set are functioning They may pinpoint faults in the circuitry to the faulty assembly or they may direct the use of any or all of the AF RF CDMA diagnostics to more extensively test the circuitry Accessing the Diagnostic Tests CAUTION A fifteen minute warm up is required The measurement limits of the SERVICE7 diagnostic tests are valid only at room temperature that is 20 to 25 C 65 to 75 F 1 Press the Preset key 2 Press the Tests key The TEST Main Menu screen appears see figure 2 10 on page 58 3 Set the Select Procedure Location field to ROM 4 Set the Select Procedure Filename field to SERVICE7 Figure 2 10 TESTS Main Menu Screen TESTS Main Menu SERVICE faContinue LOAD TEST PROCEDURE Select Procedure Location mum Procedure Filenane Library Prosrant NO LIB ROM To Screen Description Launches diagnostic and calibration programs e COMA CUSTOMIZE TEST PROCEDURE SET UP TEST SET O Analos RX TEST Execution Cond C External Devices Printer Setup Contis IBRSIC Cntrl CONFIG Channel Information Test Parameters EIEW Order of Tests bite Pass Fail Limits gas Sove Delete Procedure 5 To define test conditions see Define Test Conditions on page 59 To configure the Test Set for a printer see Configuring a Printer on page 60 6 On t
165. nal generator synthesizer and the receiver synthesizer assemblies have these LEDs mounted close to the top of the modules The location of each LED is labeled on the assembly Verify that the CDMA generator reference and the reference are working before troubleshooting the receiver synthesizer and or the signal generator synthesizer assemblies Figure 2 18 Out of lock LEDs ee TO TEES 9 SIG GEN SYNTH E Out of lock LEDS RCVR SYNTH o yt ty eat IE CDMA Generator Reference Assembly Verification 1 Turn the Test Set off and remove the external cover 2 Remove the bottom cover and verify that the cable is connected between the EXT REF IN connector and J17 on the CDMA Generator Reference assembly 3 Turn the Test Set on and verify that a 10 MHz signal is present on J15 of the CDMA Generator Reference assembly If no signal or a poor signal appears at this connector then the CDMA Generator Reference assembly is faulty 4 Remove the Reference assembly 5 Turn the Test Set on and verify that a 10 MHz signal is present on pin 20 of J63 and pin 19 of J18 This is the
166. nction is at the bottom of the screen turn it Of f If the Test Set Fails to Power up Figure 2 3 1 Is the Test Set plugged in Listen for fan operation If you don t hear it check the line fuse see figure 2 3 Fuse Spare Fuse 57 2 If there is image on the display remove the Test Set s covers and check the power supply LEDs 5 V 2 12V see figure 2 5 on page 51 If one is out the power supply or regulator board is faulty If no LEDs are lit confirm that the Test Set is connected to the main power source Also see step 5 3 Check the LEDs on the Controller assembly see figure 2 5 on page 51 The LEDs should all light up immediately on power up and then go off several seconds after a beep is heard If the LEDs do not light when the Test Set is powered up either the Controller or the Memory SBRC assembly is faulty 49 Troubleshooting Self Test Diagnostics 4 If the Test Set does not power up properly but the fan operates and the power supply voltages are correct on the Power Supply Regulator outputs the Controller may be failing Check TP2 on the Controller for 5V If 5V is present the Controller assembly is faulty 5 If there is no display but VIDEO OUT port on the rear panel has the signal shown in figure 2 4 then the Display assembly is faulty If the signal is not present then Display Drive assembly is faulty Figure 2 4 VIDEO OUT Signal 500m V div
167. ncy reset the Tune Freq to that frequency The Test Set s measurements should read as follows a TX Power should read approximately 0 001 W for each frequency b Frequency should read 900 and 1800 MHz respectively c Ifthe Test Set has the optional spectrum analyzer press the Spec Anl key to access the analog spectrum analyzer Observe the level and frequency of the signal 76 S agilent e8285 ALR Book chapters trouble fm Troubleshooting Manual Troubleshooting Procedures Isolating the RF Source The RF generator function uses the following assemblies Refer to figure 2 20 and the block diagrams in chapter 8 Block Diagrams LOIF IQ Modulator Signal Generator Synthesizer Output Section Upconverter Figure 2 20 Isolating the RF Source i Low gt mun TO RF ANALYZER Power Reference Detector IN OUT RF DUPLEX OUT Output Up Output 1Q Sig Gen Attenuator Converter Section Modulator Synthesizer 77 Troubleshooting Manual Troubleshooting Procedures 78 To isolate the RF Source 1 On the Test Set a b d e f Press Preset Press the Config key to access the CONFIGURE screen Setthe RF Display field to Freq Setthe RF Offset field to O f Press the RF Gen key to go to the analog RF GENERATOR screen Set RF Gen Freqto 1800 MHz Set Amplitude to 0 dBm Set Output Port to Dupl 2 On the external RF modulation analyzer or spectrum analyzer a b
168. nd below 8285 61811 UPCONV_ KIT FW Rev A 04 5X and above E 8285 61862 USERS GUIDE E 8285 90018 WINDOW DISPLY 6380 21010 WSHR_LK_ 1941D 2190 0577 109 Disassembly and Replaceable Parts Parts List 110 S agilent e8285 ALR Book chapters disassembly im Functional Verification The purpose of this chapter is to provide loopback self tests and mobile phone test procedures that quickly verify the functional performance of the Test Set Functional Verification Purpose Purpose The purpose of this chapter is to provide loopback self tests and mobile phone test procedures that quickly verify the functional performance of the Test Set while racked in a test system or operating stand alone If racked in a test system removing the Test Set should be avoided if all functional performance tests pass Performing and passing all tests will result in a very high level of confidence that the Test Set is functioning properly This document is not intended to provide complete troubleshooting instruction for hardware failures The desired results of the following procedures are To isolate the cause of test system problems quickly if related to the Test Set To minimize unnecessary Test Set swapping identify the root cause of poor test system yields if related to the Test Set To improve user test system quality confidence level To educate current and new production technicians on
169. nob then press the knob Press Help for information on the tests Press Exit to abort gt Functional Diagnostics AF Diagnostics RF Diagnostics COMA Diagnostics Edit Diagnostic Limits Periodic Calibration 19 Calibration 19 Denod Path Ca w TESTS IBASIC Controller Move the pointer to the desired test usina the knob then press the knob Press Menu to 30 to the Service Menus Exit to abort gt RF Modules IJ Rnalos Modulation COMA Loopback Self Test Power Supplies Functional Diagnostics EE E 62 SAagilent e8285 ALR Book chapters trouble fm Troubleshooting Functional Diagnostics RF Modules The Average and TX power meters Channel Power Meter RF analyzer IF analyzer and spectrum analyzer are used to test the signal generator Both the internal and external paths of the RF IO assembly are used in the tests Analog Modulation The demodulator in the RF analyzer and the spectrum analyzer are used to check the accuracy distortion and residuals of the FM and AM frequencies The counter is used to measure the audio frequency CDMA Loopback CDMA Analyzer is used to measure Test Mode Rho on a signal from the CDMA Generator This test is only a rough indicator of CDMA functionality Self Test The power up Self Test Diagnostics are run Refer to Self Test Diagnostics on page 48 Power Supplies The different levels of the power s
170. nstalling the product in a cabinet the convection into and out of the product must not be restricted The ambient temperature outside the cabinet must beless than the maximum operating temperature of the produc by 4 C for every 100 watts dissipated the cabinet If the total power dissipated in the cabinet is greater than 800 watts then forced convection must be used S agilent e8285 ALR Book chapters front fm Product Markings CE the CE mark is a registered trademark of the European Community A CE mark accompanied by a year indicated the year the design was proven CSA the CSA mark is a registered trademark of the Canadian Standards Association Agilent Technologies Warranty Statement for Commercial Products E8285A CDMA Mobile Station Test Set Duration of Warranty One Year 1 Agilent warrants Agilent hardware accessories and supplies against defects in materials and workmanship for the period specified above If Agilent receives notice of such defects during the warranty period Agilent will at its option either repair or replace products which prove to be defective Replacement products may be either new or like new 2 Agilent warrants that Agilent software will not fail to execute its programming instructions for the period specified above due to defects in material and workmanship when properly installed and used If Agilent receives notice of such defects during the warranty period Agilent will replace soft
171. nsverordnung vom 18 J anuar 1991 e Schalldruckpegel Lp lt 70 dB A AmArbeitsplatz Normaler Betrieb e Nach ISO 7779 1988 EN 27779 1991 Typpr fung WARNING CAUTION ENS gt Safety Considerations GENERAL This product and related documentation must be reviewed for familiarization with safety markings and instructions before operation This product has been designed and tested in accordance with IEC Publication 1010 Safety Requirements for Electronic Measuring Apparatus and has been supplied in a safe condition This instruction documentation contains information and warnings which must be followed by the user to ensure safe operation and to maintain the product in a safe condition SAFETY EARTH GROUND A uninterruptible safety earth ground must be provided from the main power source to the product input wiring terminals power cord or supplied power cord set CHASSIS GROUND TERMINAL To prevent a potential shock hazard always connect the rear panel chassis ground terminal to earth ground when operating this instrument from a dc power source SAFETY SYMBOLS Indicates instrument damage can occur if indicated operating limits are exceeded Refer to the instructions in this guide Indicates hazardous voltages Indicates earth ground terminal A WARNING note denotes a hazard It calls attention to a procedure practice or the like which if not correctly performed or adhered to could result in pe
172. nuation If the RF IN OUT connector is used as an output the signal passes through additional attenuation before reaching the connector This is why a greater signal level can be output through the DU PLEX OUT connector than through the RF IN OUT connector 34 S agilent e8285 ALR Book chapters intro fm Introduction Product Description Figure 1 6 RF Generation Path Overview Signal Generator Synthesizer IQ Modulator Assembly r 1 MHz from 500 1000 MHz e Reference 2 M Assembly Modulato div n FM from L 4 zo Mod Dist AWGN Noise from Spec Analyzer CDMA Reference Sweep L 4 4 channels of 1 amp Q data PM ADC amp Analog Cell Site rocessor Summing 1 channel of 1 amp Q data 500 1000 MHz e 500 1000 MHz main band Upconverter Assembly e div 2 250 500 MHz Amplitude 2 band Modulator ms 250 kHz 250 MHz downconverted band Automatic Level Control 1 GHz from Reference Assembly RF Adjust from AM from Mod Host Controller Distribution Assembly RF Assembly repe xus Variable Step Attenuator A DUPLEX OUT RF IN OUT To the Receiver Assembly L 35 Introduction Troubleshooting Strategy Troubleshooting Strategy You can
173. o Analyzer OUTPUT _ e Signal Generator gaius E RF OUTPUT 5 FM INPUT 7 el 55 85 ee 5 Measuring Receiver O SENE 5 E ANTENNA IN INPUT 500 Procedure 1 On the measuring receiver a Reset the instrument b Set the measurement mode to FM c Setthe high pass filter to 300 Hz d Set the low pass filter to 3 kHz 2 On the audio analyzer 182 S agilent e8285 ALR Book chapters perf_test fm Performance Tests RF Analyzer FM Distortion Performance Test 21 Reset the instrument Set the output frequency to 1 kHz Set the output amplitude to 1 4 V Set the measurement mode to distortion On the signal generator Bow m 1 Set the output frequency to 840 MHz Set the output amplitude to 0 0 dBm Set the function to FM with EXT AC Modulation Set the MOD LEVEL to 5 kHz On the Test Set Press Preset Select the INSTRUMENT CONFIGURE screen Set the RF Display field to Freq Select the RF ANALYZER screen Set the Tune Freqto 840 MHz Set Input Port field to Ant Set the IF Filter field to 230 kHz Set Squelch field to Open Select the AF ANALYZER screen Set the AF Anl Infield to FM Demod Set the Filter 1 field to 300Hz HPF Set the Filter 2 field to 3kHz LPF m Set the Detector field to For each FM deviation setting shown in the Performance Test Reco
174. of the counter will determine the accuracy of the Test Set s internal reference You will use the counter to set the timebase reference DACs Forthe Timebase Reference Using a Source calibration you will need to connect a signal generator to the front panel ANTENNA IN connector Forthe Voltmeter References calibration you will need a DC voltmeter that can measure 5 V with 0 015 accuracy Figure 5 1 Periodic Calibration Menu TESTS Main Menu SERVICE 2 LORD TEST PROCEDURE Select Procedure Location Select Procedure Filename Library Program TESTS IBRSIC Controller Description Launches diagnostic ar SERVICE MENU CUSTOMIZE TEST PROCED Move pointer to the desired program using the knob then press the knob Press Help for information on the tests Press Exit to abort WEE Channel Informati BEN Test Parameters Order of Tests d Pass Fail Limits d Save Delete Proce gt Functional Diagnostics AF Diagnostics RF Diagnostics Help ___ COMA Diagnostics Edit Diagnostic 110115 Periodic Calibration 10 Calibration 10 Denod Path Calibration TESTS IBRSIC Controller Move the pointer to the desired test using the knob then press the knob Press Menu to go to the Service Menus Exit to abort Periodic Calibration Menu gt Timebase Reference Using a Counter Timebose Reference Usina Source Voltmeter Refe
175. ok chapters perf_record fm RF Analyzer Residual FM Performance Test 23 Record Table 7 23 Performance Test Records RF Analyzer Residual FM Performance Test 23 Record For test procedure see RF Analyzer Residual FM Performance Test 23 on page 186 RF Analyzer Residual FM Test 23 Record FM Deviation Limits Hz RF MHz Upper Actual 840 7 0 1800 14 0 241 Performance Test Records Spectrum Analyzer Image Rejection Performance Test 24 Record Spectrum Analyzer Image Rejection Performance Test 24 Record For test procedure see Spectrum Analyzer Image Rejection Performance Test 24 on page 188 Table 7 24 Spectrum Analyzer Image Rejection Image Test 24 Record Image Response Applicable RF Generator Spectrum Analyzer Limits dB Firmware Frequency MHz Frequency MHz Revision Upper Actual lt A 02 XX 1229 0 4 47 lt A 02 XX 1379 6 151 47 lt A 02 XX 616 6 385 47 lt A 02 XX 873 6 645 47 lt A 02 XX 883 6 655 47 lt A 02 XX 1023 6 795 47 lt A 02 XX 1000 771 4 47 ALL 928 6 1700 47 ALL 1078 6 1850 47 ALL 2078 6 1850 7 ALL 1227 6 1999 47 ALL 576 4 805 47 ALL 771 4 1000 7 ALL 1228 6 2000 47 242 saagiente8285xALRNBookichaptersiperf_record fm Performance Test Records CDMA Generator RF IN OUT Amplitude Level Accuracy Performance Test 25 Record CDMA Generator RF IN OUT Amplitude Lev
176. or frequencies up to 1000 MHz measure the FM deviation at the RF frequencies and deviations shown in the Performance Test Record PTR and compare the measured deviation to the limits The following steps are for measurements to 2 GHz 4 On the signal generator a Set the frequency to 1500 MHz CW b Set the level to 8 dBm or whatever level is suitable for the microwave converter s LO input S agilent e8285 ALR Book chapters perf_test fm Performance Tests RF Generator FM Accuracy Performance Test 2 5 On the measuring receiver a Set the frequency offset mode to enter and enable the LO frequency 27 3 Special b Key in the LO frequency in MHz which is 1500 6 On the Test Set for frequencies of 1700 and 2000 MHz measure the FM at the deviations shown in the PIR and compare the measured deviation to the limits 151 Performance Tests RF Generator FM Flatness Performance Test 3 RF Generator FM Flatness Performance Test 3 The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 3 RF Generator FM Flatness Test 3 Record on page 206 The FM flatness of the RF generator is measured directly by the measuring receiver The Test Set s internal audio generator provides the modulation source NOTE Two setups are shown below The first setup can measure signals to 1 GHz Since the FM generator in the Test Set translates FM in the lower band direc
177. ormance Tests Chapter 7 in this chapter Performance Test Records RF Generator FM Distortion Performance Test 1 on page 146 page 202 RF Generator FM Accuracy Performance Test 2 on page 149 page 204 RF Generator FM Flatness Performance Test 3 on page 152 page 206 RF Generator Residual FM Performance Test 4 on page 155 page 208 RF Generator Level Accuracy Performance Test 5 on page 158 page 210 RF Generator Harmonics Spectral Purity Performance Test 6 on page 163 page 218 RF Generator Spurious Spectral Purity Performance Test 7 on page 165 page 221 AF Generator AC Level Accuracy Performance Test 8 on page 167 page 223 AF Generator DC Level Accuracy Performance Test 9 on page 168 page 225 AF Generator Residual Distortion Performance Test 10 on page 169 page 226 AF Generator Frequency Accuracy Performance Test 11 on page 170 page 228 AF Analyzer AC Level Accuracy Performance Test 12 on page 171 page 229 AF Analyzer Residual Noise Performance Test 13 on page 172 page 230 AF Analyzer Distortion and SINAD Accuracy Performance Test 14 on page 173 page 231 AF Analyzer DC Level Accuracy Performance Test 15 on page 174 page 232 AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 on page 175 page 233 AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 on page 176 page 234 Oscilloscope Amplitude Accuracy Performance Test 18 on page 177 page 235 RF Analyzer FM Accuracy Per
178. otocol Processor NC NC TO RP PROTO LOG 20ms FIFO ADRS 3 RESET TRIGGERS REAR PANEL GATED BUS to to DIGITAL CELLSITE DIGITAL CELLSITE 263 Block Diagrams Spectrum Analyzer Spectrum Analyzer Spectrum Analysis option 102 The LO on the Spectrum Analyzer see figure 8 10 on page 265 is swept across the span by the Controller The LO starts sweeping when the oscilloscope circuits on the Measurement board trigger the display sweep to start As the LO sweeps the spectrum analyzer filters and then amplifies thelF signal in a logarithmic detector so the signal voltage will be proportional to the log of power The signal voltageis measured by a sampler on the M easurement board and displayed Spectrum analyzer resolution bandwidth is determined by switching bandwidth IF filters on the Spectrum Analyzer These filters are set by the Controller as a function of the span selected from the front panel 264 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams Spectrum Analyzer SV3M OL Spectrum Analyzer Figure 8 10 Q4VO8 24267 5 235 58 T OL 1 0D 01 33s 8 woud ZHN0Z 389 vs NIVO STEVINVA Na w 3201 40 1no ZHWOLL 21 39025 Na See eee eee ee eee MEM Wd 378 eee ape gpe 236465
179. pback Verification Test Pass Fail Channel Power Accuracy Analog Loopback Pass Fail SINAD 80 dB gt 25 dB SINAD 100 dB gt 12 dB Wideband Sweep Pass Fail Acceptable flatness Max level Min level 5 dB TESTS Main Menu Screen ROM Diagnostic Programs Pass Fail SERVICE7 Functional Diagnostics RF Modules SERVICE7 Functional Diagnostics Analog Modulation SERVICE 7 Functional Diagnostics CDMA Loopback SERVICE7 AF Diagnostics All Tests SERVICE7 RF Diagnostics All Tests SERVICE 7 CDMA Diagnostics All Tests TESTS Main Menu Screen Calibration Programs Pass Fail SERVICE7 1Q Calibration SERVICE7 1Q Demod Path Calibration PCB CAL Channel Power Calibration Procedure see Channel Power Pass Fail Calibration on page 120 Channel Power Cal Call Setup Procedures see CDMA Mobile Phone Functional Pass Fail Test on page 121 Register Mobile Chapter 4 123 Functional Verification Functional Verification Test Record Table 4 1 Functional Verification Test Record Page to Mobile Origination from Mobile Functional Tests Procedures see CDMA Mobile Phone Pass Fail Functional Test on page 121 Receiver FER Transmitter Rho Mobile Channel Power 124 S agilent e8285 ALR Book chapters verif fm Periodic Adjustments Calibration This chapter contains the
180. pointer to the desired program using the knob then press the knob information on the tests Press Exit to Cal factors have TESTS IBRSIC Controller Press Help for abort Freauency Carrier MHz Feedthru dB 501 00 60 4 550 00 66 2 600 00 6141 650 00 63 2 700 00 57 8 700 02 61 5 750 00 67 9 800 00 63 1 850 00 57 0 900 00 65 9 950 00 60 1 1000 00 6141 been tested Help 5 HR TESTS IBASIC Controller Quadrature Spur dB Press Resume Periodic Adjustments Calibration IQ Demod Path Calibration Program Description IQ Demod Path Calibration Program Description Figure 5 7 IQ Modulation Path Calibration TESTS Main Menu SERVICE 1 raContinue LORD TEST PROCEDURE p TESTS IBRSIC Controller Select Procedure Local Select Procedure Filer SERVICE MENU Description Move pointer to the desired program using the Launches diagnostic ot knob then press the knob Press Help for information on the tests Press Exit to abort ________________ CUSTOMIZE TEST PROCEDI gt Functional Diagnostics Channel Informati AF Diagnostics Test Parameters RF Diagnostics Help J Order of Tests COMA Diagnostics 4 Pass Fail Limits Edit Diagnostic Limits Sove Delete Proce Periodic Calibration 10 Calibration 5 IQ Denod Path Calibration TESTS IBRSIC Controlle
181. pt 2 state Press Noor End on mobileto end call 5 Page mobile phone Chapter 4 121 Functional Verification CDMA Mobile Phone Functional Test Press the Call Page key on the Test Test Set should page the mobile Mobile should automatically connect to Test Set 6 Mobile phone measurements record all test results in Table 4 1 on page 123 6a Receiver FER Test Press the CDMA SCREENS RX test key e Set the Display Interim Results field to ves e Set the FER Spec field to 0 502 e Set Sctr A Pwr field to 90 when noisolation box is used e Set Meas Cnt1 filed to Single Begin measurement highlight the Arm field Test Set should return a Passed Status 6b Transmitter Rho Test Press the CDMA SREENS TX test key Set Meas Cnt1 field to cont Measured Traffic Rho should be 20 980 6c Mobile Channel Power Test Press the CDMA SCREENS Call control key Set Chan Power field to Chan Power Measured channel power should be about 1 5 dB of the calculated 1 deal Mobile Power value 7 End call press the End Release button on the Test Set 122 S agilent e8285 ALR Book chapters verif fm Functional Verification Functional Verification Test Record Functional Verification Test Record Tested By Date Test Set Serial Cell PhoneESN Cell Phone MIN Table 4 1 Functional Verification Test Record Power Up Self Test Pass Fail All self tests passed Channel Power Loo
182. pter 3 Disassembly and Replaceable Parts Downloading calibration data see chapter 2 Troubleshooting and regenerating calibration data see See System Power Calibration Program on page 39 Performing periodic calibration see chapter 5 Periodic Adjustments Calibrati on Functional Verification see chapter 4 Functional Verification 37 Introduction Calibration and Performance Verification Calibration and Performance Verification NOTE NOTE The Test Set periodically requires some maintenance to verify that it meets its published specifications See Periodic Adjustments on page 126 Periodic Adjustments calibration consists of running several built in calibration programs The recommended interval for periodic adjustments is 12 months An external frequency counter and dc voltmeter are required See Chapter 5 Periodic Adjustments Calibration on page 5 The recommended Test Set calibration interval is 24 months This is accomplished by performing the performance tests see Chapter 6 Performance Tests page 141 or sending the Test Set to an Agilent Calibration Center or other qualified calibration lab The performance tests verify that the Test Set performs as indicated in the Specifications These tests should be performed if the Test Set s operation is suspect even though it passes all internal diagnostic checks This identifies whether a problem actually exists in the Test
183. quency Generator Gain program should be performed before running the External Modulation Path Gain program The path in this program runs from the external MODULATION IN connector through the Modulation Distribution assembly through the Monitor Select Switch and then through Audio Analyzer 1 to the Test Set s internal DVM The dc source is Audio Frequency Generator 1 through the AUDIO IN connector and an external cable The goal of this procedure is to set the External Level Amplifier gain DAC on the Modulation Distribution assembly to produce a gain of exactly 4 between the MODULATION IN connector and output of the Monitor Select Switch This requires measuring the input and output levels calculating the gain changing the DAC setting and then repeating the process until the calculated gain equals 4 Audio Analyzer 1 Offset Two DC offsets are measured and downloaded as calibration factors to the Audio Analyzer 1 assembly These measurements are determined under the following conditions nput select switch grounded AUDIO INPUT selected with return conductor grounded Variable Frequency Notch Filter The calibration factors for tuning the variable frequency notch filter are determined as follows The input to the filter is set to 10 evenly spaced frequencies between 300 and 10 000 Hz The DAC that tunes the notch filter is adjusted for best null of the tune error voltage From this data three coefficients of a parabola
184. r Calibration Information 014 DAC Offset 34 New DAC Offset 35 Resume 014 Demod Nominal Power 24 3077888 New Denod Nominal Power 24 63188545 Mobile power at port 6 50606225 Mobile power at LOIF 18 1258232 139 Jic Adjustments Calibration IQ Demod Path Calibration Program Description 140 5 8285 R Bookichaptersperiod Performance Tests This chapter contains the performance test procedures for the Test Set The tests in this chapter verify that the Test Set performs to its published specifications 141 Performance Tests Procedure and Equipment Procedure and Equipment How to Use the Performance Tests NOTE The recommended Test Set calibration interval is 24 months This is accomplished by performing the performance tests or sending the Test Set to an Agilent Calibration Center or other qualified calibration lab Run the Performance Tests in table 6 2 Performance Tests amp Records Location on page 144 using the specified Test Equipment from table 6 1 Required Test Equipment by Model on page 143 Compare and record the data for each test onto the applicable Performance Test Record PTR Table 6 2 on page 144 shows the page number of the PTR associated with each performance test Test Set Operation To perform the following performance test procedures you need to know basic Test Set operation You should be familiar with the front panel the variou
185. rd PTR do the following a Adjust the audio analyzer s level until the measuring receiver reads the FM deviation shown in the PTR Read the distortion on the audio analyzer and compare the results to the limits shown in the PTR 183 Performance Tests RF Analyzer FM Bandwidth Performance Test 22 RF Analyzer FM Bandwidth Performance Test 22 The purpose of this test is to verify that the Test Set meets the specification limits in Performance Test Record table 7 22 RF Analyzer FM Bandwidth Test 22 Record on page 240 An audio signal from the audio analyzer provides FM for the signal generator The signal generator provides an RF signal with FM to the Test Set s internal RF analyzer The measuring receiver is used to monitor FM deviation as the level of the audio signal from the audio analyzer is varied The audio rate is varied in several steps from 20 Hz to 70 kHz The difference between the maximum and minimum FM peak deviation is noted Setup Figure 6 27 Audio Analyzer OUTPUT Signal Generator e al e _ RF OUTPUT amp BEBE FM INPUT o 5 a 5 ojsges8 Measuring Receiver 96 9 ANTENNA IN INPUT 500 Procedure 1 On the measuring receiver a Reset the instrument b Set the measurement mode to FM c Set the all filters off 184 S
186. red by factory generated calibration data which is stored in CAL ROM Input Gain Control Step attenuators in the RF Input Output Section are switched in and out manually or automatically This keeps the input level within an optimum range for the mixers IF amplifiers and detectors 253 Block Diagrams RF Input Output Section RF 1 0 Figure 8 2 SW3W OL 0171307055 01 1707139 NI AND2G JYAS WIW o gt L23NNO2 ON 50 fd 3301 SV3W OL 110 Nl dais 9252 0 Ol 79435 7031407 35109 i xf 1ndino 2907 IAYO 01 MOLVON3LLV 907VNY li 52 WOU 1081N03 ai 1no N e 4 k 00 4 gt 30123134 O 17 N os 7041405 9315 gpo 5 E lt O lt O i304 L sr 30 VNN3INY OL SYOLVANSLLVY SE 0 O 48 254 s agilent e8285 ALR Book chapters blockdiag fm RF Analyzer Section Frequency Conversion Block Diagrams RF Analyzer Section NOTE Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set The Downconverter see Figure 8 3 on page 257 produces an IF of 114 3 3
187. red program using the knob then press the knob Press Help for Channel Informati information on the tests Press Exit to abort Test Parameters Order of Tests 8 Pass Fail Limits gt Functional Diasnostics Save Delete Proce AF Diasnostics RF Diagnostics COMA Diagnostics dit tTasnostic Periodic Calibration IQ Calibration 10 Denod Path Calibration 130 siagilent es285 ALR Book chapters period_adj fm TESTS IBASIC Controller exit Periodic Calibration Menu Descriptions Periodic Adjustments Calibration Periodic Calibration Menu Descriptions This section describes the adjustment programs listed under the Periodic Calibration menu Figure 5 3 Periodic Calibration TESTS Main Menu SERVICE 1 PE LORD TEST PROCEDURE Select Procedure Filer Description Launches diagnostic 01 CUSTOMIZE TEST PROCED Channel Informati Test Parameters Order of Tests 4 Pass Fail Limits Save Delete Proce Periodic Calibration Menu Screen Select Procedure SERVICE MENU i Move pointer to the desired program using the knob then press the knob Press Help for information on the tests Press Exit to abort Functional Diagnostics AF Diagnostics RF Diagnostics Help COMA Diaosnostics Edit Diagnostic Limits Periodic Calibration IQ Calibration 5 BE FaContinue TESTS IBASIC Controller
188. rement to level Select the RF GENERATOR screen Set AFGen1 field to Audio Out Set the AFGen1 Freqfieldto 0 0 Hz Set the Audio Out field to DC Bum j i o Set the level of Audio Frequency Generator 1 as shown in the Performance Test Record and measure the DC level Compare the measured voltage to the limits 174 S agilent e8285 ALR Book chapters perf_test fm AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 Setup Figure 6 21 Procedure Performance Tests AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 16 AF Analyzer Frequency Accuracy to 100 kHz Test 16 Record on page 233 To measure frequency accuracy up to 100 kHz an AC signal at the audio input is measured by an external frequency counter and compared to the Test Set s internal audio frequency counter Audio Analyzer f 7 TOUTPUT Counter AUDIO IN High INPUT 1 Set the frequency counter to measure frequency 2 On the Test Set Press Preset a b Select the AF ANALYZER screen Setthe AF Infield to Audio In d Setthe Filter 1fieldto 20 Hz HPF e Setthe Filter 2fieldto 99kHz LPF f Set the lower right measurement display to AF Freq
189. rences serv Menu Audio Freauency Generator Gain External Modulation Path Gain Audio Analyzer 1 Offset Variable Freauency Notch Filter 128 S agilentie8285 ALR Book chapters period_adj fm Periodic Adjustments Calibration Storing Calibration Factors Storing Calibration Factors You should understand the calibration factor storage process before running any of the following programs Periodic Calibration IQ Calibration IQ Demod Path Calibration or System Power Calibration AS a program runs calibration factors are computed and applied When all the calibration factors have been acquired the program stops and asks if the user wants the calibration factors to be stored At this point it should be emphasized that the new calibration factors are now being used by the Test Set If you do not store them at this point they will be used by the Test Set until the power is switched off even though they have not been stored If you do not store the calibration factors but run another calibration program and then store the calibration factors the calibration factors from the previous program will be stored along with the calibration factors just acquired unless the power is cycled between the tests Storing calibration factors copies the calibration factors from volatile to non volatile memory that is memory that is not erased when the power is turned off Also when storing calibration factors be sure to wait for the message
190. results as was done in step 3 and compare the calculated deviation to the limits 154 S agilent e8285 ALR Book chapters perf_test fm Performance Tests RF Generator Residual FM Performance Test 4 RF Generator Residual FM Performance Test 4 NOTE Initial Setup Figure 6 7 The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 4 RF Generator Residual FM Test 4 Record on page 208 The residual FM of the RF generator is measured directly by the measuring receiver An external LO is used to improve the residual FM of the measuring receiver An audio analyzer with a CCITT psophometric filter is required to measure the demodulated FM Two setups are shown see figure 6 7 and figure 6 8 on page 156 The first setup is capable of measuring signals to 1 GHz The second setup has a microwave converter which covers the full measurement range of FM signals to 2 GHz The microwave converter s LO must be a low residual FM synthesizer Setup for Measurements to 1 GHz 10 00 Audio Analyzer 00 INPUT 0000 DUPLEX OUT Measuring Receiver MODULATION OUTPUT EXT LO INPUT INPUT 500 Signal Generator RF OUTPUT 155 Performance Tests RF Generator Residual FM Performance Test 4
191. rocedure Location field to Card Set the Select Procedure Filename field to SYSPWRO Press the Run Test key 3 Follow the instructions as they are presented As the power difference is displayed write these numbers in the Performance Test Record and compare them with the limits If two passes are chosen average the two sets of data After the acquisition of levels is complete select No when asked if you want the calibration factors downloaded into the Test Set s memory 80000 ol J 00080 0080 80000 Measuring Receiver SENSOR INPUT 500 179 Performance Tests RF Analyzer FM Accuracy Performance Test 20 RF Analyzer FM Accuracy Performance Test 20 The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 20 RF Analyzer FM Accuracy Test 20 Record on page 238 The signal generator provides the RF signal with FM An audio signal from the audio analyzer provides FM for the signal generator The signal is measured both by the Test Set s internal RF analyzer and the measuring receiver The FM signal comes from the external audio source in the audio analyzer The audio level is varied until the modulation is at the desired FM deviation as measured by the measuring receiver Result
192. rs Wdisassembly fm Disassembly and Replaceable Parts Disassembly Procedures Figure 3 19 Power Supply Subassemblies SMM3 0 8SEMPNTX 1 t T HEATSINK PLATE RBN 16CNDCT 28AWG 5 4 0 10SEMPNTX Qty 6 HRN 20CNDCT 18AWG nz li POWER SUPPLY REAR PANEL CONNECTOR ASSY E8285 61013 NOTE When reassembling power supply assembly to chassis ensure guide pins are aligned properly into chassis CT 103 Disassembly and Replaceable Parts Disassembly Procedures Figure 3 20 Power Supply Assembly Rear Panel SA TRIG OUT 7 WSHR_LK_ 1941D Qty2 STDF 3271 6 32 Qty 2 LINE MODULE NUT HEX DBL CHAM Qty 9 104 s agilent e8285 ALR Book chapters disassembly fm CA CX BNC DSUB 2 Parts List Table 3 1 Disassembly and Replaceable Parts Replaceable Parts Parts List Description Part Number 6KHZ BPF 4014 AY 08920 60268 ANALOG C SITE KIT FW Rev A 04 54 and below 08924 61807 ANALOG C SITE KIT FW Rev A 05 03 and above E 8285 61845 APPLICATN_GUIDE E8285 90019 AUDIO_ANALYZER_ 1_KIT 08920 61811 AUDIO_ANALYZER_2 KIT 08920 61853 AY STRAP HANDLE E8285 61012 BTRY_3 0V_1AH on MEMORY SRBC KIT 1420 0394 BTRY_3 0V_1 2AH on REGULATOR KIT 1420 0338 BRACKET_RELAY E 8285 00044 BRACKET_RELAY E8285 00044 BUMPER REAR E5515 40009 C MESS FLTR 08920 61056 CA_AY RBN 6380 6105
193. rs front fm 8 Agilent will be liable for damage to tangible property per incident up to the greater of 300 000 or the actual amount paid for the product that is the subject of the claim and for damages for bodily injury or death to the extent that all such damages are determined by a court of competent jurisdiction to have been directly caused by a defective Agilent product 9 TOTHE EXTENT ALLOWED BY LOCAL LAW THE REMEDIES IN THIS WARRANTY STATEMENT ARE CUSTOMER S SOLE AND EXCLUSIVE REMEDIES EXCEPT AS INDICATED ABOVE IN NO EVENT WILL AGILENT OR ITS SUPPLIERS BE LIABLE FOR LOSS OF DATA OR FOR DIRECT SPECIAL INCIDENTAL CONSEQUENTIAL INCLUDING LOST PROFIT OR DATA OR OTHER DAMAGE WHETHER BASED IN CONTRACT TORT OR OTHERWISE FOR CONSUMER TRANSACTIONS IN AUSTRALIA AND NEW ZEALAND THE WARRANTY TERMS CONTAINED IN THIS STATEMENT EXCEPT TO THE EXTENT LAWFULLY PERMITTED DO NOT EXCLUDE RESTRICT OR MODIFY AND ARE IN ADDITION TO THE MANDATORY STATUTORY RIGHTS APPLICABLE TO THE SALE OF THIS PRODUCT TO YOU DECLARATION OF CONFORMITY according to ISO IEC Guide 22 and EN 45014 Manufacturer s Name Agilent Technologies Manufacturer s Address Spokane Division 24001 E Mission Avenue Liberty Lake Washington 99019 9599 USA declares that the product Product Name CDMA Mobile Station Test Set Model Number Agilent Technologies E8285A Product Options All conforms to the following Product specifications Safety TEC 61010
194. rsonal injury Do not proceed beyond a WARNING sign until the indicated conditions are fully understood and met A CAUTION note denotes a hazard It calls attention to an operation procedure practice or the like which if not correctly performed or adhered to could result in damage to or destruction of part or all of the product Do not proceed beyond an CAUTION note until the indicated conditions are fully understood and met S agilent e8285 ALR Book chapters front fm WARNING Safety Considerations for this Instrument This product is a Safety Class instrument provided with a protective earthing ground incorporated in the power cord The mains plug shall only be inserted in a socket outlet provided with a protective earth contact Any interruption of the protective conductor inside or outside of the product is likely to make the product dangerous Intentional interruption is prohibited Whenever it is likely that the protection has been impaired the instrument must be made inoperative and be secured against any unintended operation If this instrument is to be energized via an autotransformer for voltage reduction make sure the common terminal is connected to the earth terminal of the power source If this product is not used as specified the protection provided by the equipment could be impaired This product must be used in a normal condition in which all means for protection are intact only No operator serviceable
195. s 127 troubleshooting 74 126 calibration factors 129 calibration procedures 118 carrier feedthrough minimizing 137 CDMA analysis diagram 32 CDMA Diagnostics See diagnostics CDMA Mobile Phone Functional Test 121 CDMA Signal Analysis 32 Channel Power Calibration 120 Channel Power Level Accuracy CDMA Analyzer performance test 198 Channel Power Loopback verification test 117 clearing RAM 81 297 codes See failure codes connectors torque settings 84 Control Interface assembly 28 controller replacing 91 Counter Connection field SERVICE screen 79 covers removing external and internal 87 Index 299 Index D Distortion and SINAD AF DACs Analyzer performance test IQ 137 a d settings 81 downloading calibration data 85 timebase reference 135 DC Level Accuracy AF Analyzer performance test 174 DC Level Accuracy AF Generator performance test 168 demodulation diagram 31 diagnostic error messages 68 diagnostic self test LED codes 53 diagnostics AF Diagnostics accessing 64 All Audio Tests 64 Audio Analyzer 1 External Paths 64 Audio Analyzer 1 Internal Paths 64 Audio Analyzer 2 64 AudioF requency Generators 1 and 2 64 Mod Distribution E xternal Paths 64 Mod Distribution Internal Paths 64 Preliminary Audio Paths 64 CDMA Diagnostics accessing 67 Functional Diagnostics accessing 58 Analog Modulation 63 CDMA Loopback 63 Power Supplies 63 RF Modules 63 Self Tes
196. s can contact the factory through email Parts information is also available from Agilent Technologies When calling or writing for repair assistance please have the following information ready Instrument model number Instrument serial number tag located on the rear panel Installed options if any tag located on the rear panel Instrument firmware revision displayed at the top of the screen when the Test Set is powered up and is also displayed on the CONFIGURE screen Support Telephone Numbers and E mail Address Call Center 1 800 922 8920 Instrument Support Center 1 800 403 0801 RF Comms Service Assistance International r 1 509 921 3848 D S only E 1 800 827 3848 e Service Parts Identification U S amp International 1 916 783 0804 Direct Parts Ordering US 1 800 227 8164 EMail Spokane Service aagil ent com 41 Introduction Hardware and Firmware Enhancements Hardware and Firmware Enhancements NOTE Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set The hardware and firmware of the Test Set are enhanced
197. s display screens and knob operation cursor control You should be able to operate the Test Set s RF generator RF analyzer AF generators AF analyzer spectrum analyzer optional and oscilloscope NOTE Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set NOTE Press Preset on the Test Set before beginning each test Test Equipment and Operation The test equipment shown in table 6 1 Required Test Equipment by Model on page 143 is needed to do all of the performance tests Usually a setup drawing at the beginning of each test procedure shows the equipment and hook up needed for that particular test Generic names are used for the test equipment shown in the setup drawings To find alternatives to the equipment listed in table 6 1 look up their specifications in the Agilent Technologies Test and Measurement Catalog and use the specifications to find equivalent instruments The test procedures give critical instrument settings and connections but they don t tell how to operate the instruments Refer to each instrument s operating manual 142 S agilent e8285 ALR Book chapters perf_test fm Performance Tests Procedure and Equipment Table 6 1 Required Test Equipment by Model Agilent Model Number Model Name Test Number Mini Circuits
198. s from this test give an indication of problems in the audio section of the Test Set Setup Figure 6 25 Audio Analyzer e OUTPUT a 5 Signal Generator ANTENNA IN RF OUTPUT FM INPUT Measuring Receiver INPUT 500 Procedure 1 On the measuring receiver a Reset the instrument b Set the measurement mode to FM c Set the detector to PK d Set the LP Filter to 3 kHz 2 On the audio analyzer a Reset the instrument b Setthe output frequency to 1 kHz 180 S agilent e8285 ALR Book chapters perf_test fm C Performance Tests RF Analyzer FM Accuracy Performance Test 20 Set the amplitude to 1 42 V 3 On the signal generator a b Set the output frequency to 840 MHz Set the amplitude to0 0 dBm Set the function to FM with EXT AC Modulation 4 On the Test Set a b Press Preset Select the CONFIGURE screen Set the RF Display field to Freq Set the Gen Anl 1 0 MHz pos gt k 1 Select the RF ANALYZER screen Set the Tune Freqto 840 MHz Set the IF Filter field to 230 kHz Select the AF ANALYZER screen Set the Anl Infield to Demod Set the Filter 1 fieldto 20 Hz HPF Setthe Filter 2fieldto 3 kHz LP Set th
199. sa This is necessary to make the diagnostics self contained that is they run without external equipment Some general purpose RF test equipment will be needed RF signal generator RF modulation analyzer or spectrum analyzer Isolating the RF Analyzer The RF Analyzer function uses the following assemblies Refer to figure 2 19 and the block diagrams in chapter 8 Block Diagrams Downconverter Receiver Receiver Synthesizer Spectrum Analyzer optional Isolating the RF Analyzer Input Down Receiver amp Demod Attenuator Conversion FM AM SSB Receiver Spectrum optional Power Detector Splitter Output Reference OPP Over Power Protection TRPP Reverse Power Protection RF Analyzer FROM RF SOURCE 75 Troubleshooting Manual Troubleshooting Procedures To isolate an RF analyzer problem 1 On the Test Set a Press Preset b Press the Contig to access the CONFIGURE screen Setthe RF Display field to Freq Setthe RF Offset field to O f c Rotate the knob to the field under analog press the knob and select RF ANL to go to the analog RF ANALYZER screen Setthe Tune Freq to 900 MHz Setthe Input Port 0 IN 2 On the external RF signal generator a Setthe frequency to 900 MHz CW b Set the amplitude to 0 dBm c Connect the output to the Test Set s RF IN OUT connector 3 Set the RF signal generator s frequency to 900 and then 1800 MHz For each freque
200. scriptions Field Names and Descriptions Voltmeter Connection This field selects the desired circuit node for voltage measurements To change the voltmeter connection use the knob to select the Voltmeter Connection field A Choices menu will appear Move the cursor to the desired circuit node in the list and push the cursor control knob The reading is displayed in the Voltage measurement field at the top left of the display Because the nodes being measured must be in the range of 0 to 5 volts the measurement of some points are scaled to that measurement range For example the 12 Volt reference MEAS_12V_REF should measure about 5volts The 12 Volt reference MEAS NEG 12V REF should measure about 5 volts Many of the voltage measurements are only valid after a number of instrument settings are changed When run the diagnostic routines make the necessary circuit changes and measurements automatically comparing the measurements to known limits for each node Counter Connection This field selects the desired circuit node to connect to the Test Set s internal frequency counter The reading is displayed in the Frequency measurement field at the top right of the display 79 Troubleshooting Service Screen To change the counter connection use the knob to select the Counter Connection field AChoices menu will appear Select the desired circuit node Figure 2 21 Service Screen CONFIGURE Range Hold R
201. sing To downconvert the CDMA signal the 114 3 MHz IF is mixed with a 117 9864 M Hz local oscillator LO signal to produce a 3 6864 MHz IF The LO signal is from an oscillator that is phase locked to a 10 MHz signal from the CDMA Reference module The 3 6864 MHz signal is split and goes tothe Receiver DSP assembly and also through a variable gain IF amplifier before Q demodulation The demodulated and Q baseband signals arethen routed to the Digital Cellsite assemblies Under control from the Protocol Processor assembly the Digital Cellsite assemblies use the demodulated 10 information to set up and maintain calls to CDMA phones The Digital Cellsite 1 assembly also supplies feedback to the CDMA LO IF Demodulation assembly to control the level of the variable gain IF amplifier into the demodulator The Receive DSP assembly converts digitizes and provides final analysis on the 3 6864 MHz signal to make measurements such as rho timing accuracy carrier feedthrough and phase error Figure 1 5 Analyzing CDMA Signals To Spectrum Analyzer DMA LO IF D lation A I 114 3MHz IF E emodu eons ssemb T a Digital Cellsite Protocol from Receiver 1 amp 2 Assemblies Processor 117 9864 MHz A data IQ IQ Decoding and Demodulator 29313 a CDMA Generator Call Setup and Data Coding Control a IF Gain Control Receive DSP Assembly CDMA IQ Modulation Measurements 32 S agilent
202. splay Select Printer to print the test results as well as display them on the CRT 3 Set the Output Results For field to All 4 Setup the If Unit Under Test Fails field Select Continue to continue to the next test point Select Stop to pause testing at that point 59 Troubleshooting Functional Diagnostics 60 5 Set up the Test Procedure Run Mode field Select Continuous to run the tests continuously Select Single Step to pause after each measurement 6 Verify that the Autostart Test Procedure on Power Up setting is Off Configuring a Printer Only perform the following steps if you want to print test results to a printer 1 Press the Tests key 2 On the TESTS Main Menu select Print Printer Setup TESTS Printer Setup screen appears Figure 2 12 TESTS Execution Conditions TESTS Printer Setup utput Results To utput Results Fort Bll Failures racontinue Output Heading PRINT SETUP PRGE CONTROL Lines Pase 60 Printer Port F Start Serial 9 Ye Q 3 Under PRINT SETUP select Model and the printer of your choice 4 Setthe Printer Port for the side panel connector your printer is connected to Parallel 15 Serial 9 or GPIB If an GPIB printer is used you need to enter the printer s two digit bus address when the Printer Adrs field appears Example enter 1 or 01 for bus address 701 Also press the Shift key then the INST CONFIG key to access the
203. stortion Limits Revision Upper Actual lt A 02 XX 30 99 1 0 50 lt A 02 XX 30 5 1 0 50 lt A 02 XX 312 5 5 1 0 50 lt A 02 XX 425 50 1 0 50 lt A 02 XX 501 99 1 0 50 lt A 02 XX 501 50 1 0 50 lt A 02 XX 501 5 1 0 50 lt A 02 XX 568 75 50 1 0 50 lt A 02 XX 656 25 99 1 0 50 lt A 02 XX 656 25 50 1 0 50 lt A 02 XX 656 25 5 1 0 50 lt A 02 XX 750 99 1 0 50 lt A 02 XX 750 50 1 0 50 lt A 02 XX 750 5 1 0 50 ALL 856 25 99 1 0 50 ALL 856 25 50 1 0 50 ALL 856 25 5 1 0 50 ALL 956 25 50 1 0 50 ALL 976 002 5 1 0 50 ALL 1000 99 1 0 50 ALL 1000 50 1 0 50 ALL 1000 11 1 0 50 ALL 1000 5 1 0 50 S agilent e8285 ALR Book chapters perf_record fm Performance Test Records RF Generator FM Distortion Performance Test 1 Record S Line RF Deviation Rate FM Distortion Limits 46 Revision EE Upper Actual ALL 1000 6 1 0 50 ALL 1000 7 1 0 50 ALL 1000 8 1 0 50 ALL 1000 9 1 0 50 ALL 998 401 8 1 0 50 lt A 02 XX 768 001 8 1 0 50 lt A 02 XX 512 001 8 1 0 50 lt A 02 XX 511 601 8 1 0 50 lt A 02 XX 511 201 8 1 0 50 The following entries are for the 2 GHz setup ALL 1700 99 1 1 00 ALL 1700 50 1 1 00 ALL 1700 5 1 1 00 ALL 2000 99 1 1 00 ALL 2000 50 1 1 00 ALL 2000 5 1 1 00 203 Performance Test Records RF Generator FM Accuracy Performance Test 2 Record RF Generator FM Accuracy Performance Test 2 Record For test proc
204. strument S agilent e8285 ALR Book chapters perf_test fm b c d On the Test Set coe B h Performance Tests RF Generator Residual FM Performance Test 4 Set the measurement mode to AC level Select the CCITT Weighting filter Set the low pass filter to 30 kHz Press Preset Select the CONFIGURE screen Set the RF Display field to Freq SetRF Offset to Off Set RF Output to Dupl Select the RF GENERATOR screen Setthe RF Gen Freq field to the appropriate RF frequency based on the firmware revision see NOTE above from the Performance Test Record Set the Amplitude to 10 dBm For frequencies up to 1000 MHz and for each line in the Performance Test Record PTR do the following a Set the signal generator used as an LO for the measuring receiver to the LO frequency shown in the PTR Set the Test Set to the RF frequencies shown in the PTR Measure the ac level in mV on the audio analyzer Multiply the measured ac levels by 1000 to convert them to FM deviation in Hz and compare the computed results to the limits shown in the PTR The following steps are for measurements to 2 GHz On the signal generator a Set the frequency to 1500 MHz CW for 1700 MHz 1800 MHz CW for 2000 MHz Set the level to 8 dBm or whatever level is suitable for the microwave converter s LO input On the measuring receiver a b Set the frequency offset mode to enter and enable the LO
205. surement range of FM signals to 2 GHz Setups Figure 6 30 Setup 1 for Measurements to 1 GHz Power Meter 88818888 52859609 8 O ofseen8 INPUT 500 RFINOUT Sensor Module Procedure 1 Before connecting the equipment on the measuring receiver a Resetthe instrument b Zero and calibrate the sensor module NOTE Make sure the sensor module s calibration data is entered into the measuring receiver 2 Connect the equipment as shown in Setup 1 190 S agilent e8285 ALR Book chapters perf_test fm Performance Tests CDMA Generator RF IN OUT Amplitude Level Accuracy Performance Test 25 3 On the Test Set a e f a b Press Preset Select the CONFIGURE screen and set RF display to freq Select the CDMA CALL CONTROL screen Set the RF Gen Freq field to 836 52 MHz Select the CDMA GENERATOR CONTROL screen Set the Sctr A Pwrto 20 5 dBm On the measuring receiver Set the measurement mode to RF Power Set the display to log Press the Calibrate key 5 Set the Test Set to the frequencies and levels listed in the and record the values 191 Performance Tests CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26 CDMA Generator DUPLEX OUT Amplitude Level Accuracy Performance Test 26 Set
206. t gt gt 2 3 gt he 8 8 ER M 28 M 2 M 204 54 M 95 59 M 0 59 S C M 951 34 MODO M 20 39 uo1vno3as 90 01 20 01 10938 2 AS 4816 83113 1 008102 170 6 170 Si HO NO 54 mere ina ie E 30M0 fuan ia pes 5446 170A 0 ABIS AS HOLIMS 27 LATA vt Andino lndNI A ddhnS H3MOd indino lndNI ATddNS H3MOd YOLISNNOD Nid YOLISNNOD Hf Lid INIM OZ 9f Regulator Reference Regulator Section Figure 8 25 Block Diagrams SHOLWINDSY NIHDLIMS YA v 5 agilent e8285 ALR Book chapters blockdiag fm 286 s Block Diagrams Instrument Control Section Instrument Control Section Digital Control Display The Test Set s digital control is driven by two assemblies Memory SBRC Controller The controller receives user control information by either the control interface or by the front panel Operating firmware on the M emory SBRC figure 8 26 on page 288 is then used by the Controller figure 8 27 on page 289 assembly to generate digital control for the Test Set The digital control bus information is passed back to the Memory SBRC assembly which controls most of the Test Set s modules and assemblies TheTest Set s display da
207. t 63 RF Diagnostics accessing 65 All RF Tests 65 Down Converter 65 Output 65 Receiver 65 Receiver Synthesizer 65 Reference 65 RF Input Output 65 Signal Generator Synthesizer 65 Spectrum Analyzer 65 Upconverter 65 diagnostics tests 118 Digital Cellsite assemblies 32 33 Digital Cellsite assembly block diagram 260 disassembly and replacement 87 300 enhancements firmware 42 hardware 42 error codes See failure codes error messages Autostart Test Procedure on Power Up 49 Change Ref L evel Input Port or Attenuator 68 Direct latch write occurred 68 ERROR 173 IN XXXX Active system 68 Printer does not respond 68 diagnostic 68 time outs 69 External Modulation Path Gain adjustment 134 Index Index F G failure codes GateTimefield SERVICE screen diagnostic displayed 51 80 diagnostic returned over GPIB 51 SeeAlso LEDs failures power up 48 self test 48 firmware enhancements 42 flowchart troubleshooting 47 FM Accuracy RF Analyzer performance test 180 FM Accuracy RF Generator performance test 149 FM Bandwidth RF Analyzer performance test 184 FM Distortion RF Analyzer performance test 182 FM Distortion RF Generator performance test 146 FM Flatness RF Generator performance test 152 Frequency Accuracy AF Generator performance test 170 Frequency Accuracy at 400 kHz AF Analyzer performance test 176 Frequency Accuracy to 100 kHz
208. t 24 Set the RF In Ant field to Ant Set the Ref Level field to 25 dBm Set the Span field to 5 kHz Set the Controls field to Marker Set the Marker field to Center Freq Set the Controls field back to Main Setthe signal generator s frequency and the Test Set s spectrum analyzer center frequency as shown in the Performance Test Record PTR and read the image response on the spectrum analyzer The image response is the spectrum analyzer s marker level in dBm minus the signal generator s output level minus 20 dBm In other words add 20 dB to the marker level Compare the results to the limits 189 Performance Tests CDMA Generator RF IN OUT Amplitude Level Accuracy Performance Test 25 CDMA Generator RF IN OUT Amplitude Level Accuracy Performance Test 25 The purpose of this test is to verify that the Test Set meets the specification limits in PTR Performance Test Record table 7 25 CDMA Generator RF In Out Test 25 Record on page 243 The amplitude level accuracy of the CDMA generator is measured directly with a power meter These measurements are made at the top and bottom of the CDMA generator s vernier range NOTE Two setups follow The first setup can measure signals to 1 GHz Since the FM generator in the Test Set translates FM in the lower band directly into the 1 7 to 2 GHz range testing to 1 GHz is adequate when verifying a repair The second setup has a microwave converter which covers the full mea
209. t of the sweep the gain of signal path the Audio Analyzer assemblies and the volts per division setting The oscilloscopes trigger signals from the side panel connector the Signaling Source and Analyzer assembly figure 8 19 on page 277 and the internal trigger signal are used by the Measurement assembly and the Controller to determine when to start the scope sweep The Controller adds the pre triggering ti me entered from the front panel 266 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams Audio Analyzer Section 2 IVNV OGNV 01 oianv Qauala4 Audio Analyzer 1 Figure 8 11 123135 2 33113 ol Iwas 7 anous Pm 4 IVNV OGNV 01 8 AVOW dor dik ow olan 22 1117 1212 arae H pass mis 3o 0 dE xr 2 6 SOVLIOA AV3d LONI ag O N3d 100 xnW oianv Q YSI O z 13 0 13 NOILNIYLSIG GOW IVNV 01 07 020 Q QOH3G 12313S 1 41 I 1 xnv 2 52 20 123135 831114 L IWNV OIGNV 267 Block Diagrams Audio Analyzer Section Audio Analyzer 2 Figure 8 12 sde zjeue oipne 104100 YOLINOW 3WfY10A LNOYS yaTIONLNOD 9679 WOHJ uds
210. t the Test Set NOTE Figure 2 1 DIAG LEDs Document the result of each step in case you need to contact Agilent Technologies for service assistance General troubleshooting steps are illustrated in figure 2 2 on page 47 Periodic Adjustment Interval The calibration programs Periodic Calibration IQ Calibration and IQ Demod Path Calibration should be performed after the replacement of any assembly referred to in table 5 1 Assembly Calibration Information on page 127 or at least every 24 months See Chapter 5 Periodic Adjustments Calibration on page 125 for details On power up the Test Set runs the Self Test Diagnostic Most of the Test Set s digital control functions are tested The outcome of the test appears on the display if operating and on four DIAG LEDs 0 1 2 3 and 4 viewable digital controller unit see figure 2 1 you must remove the external and top internal covers to view the LEDs LEDs Digital Controller Board 1 Mill MODULE o 5 o 46 S agilent e8285 ALR Book chapters trouble fm Figure 2 2 Troubleshooting How to Troubleshoot the Test Set Agilent E8285A Test Set Troubleshooting Flowchart
211. t the printer s power is on and that it is correctly cabled For GPIB printers make sure the printer is correctly addressed If a serial printer is used you may have to change the serial communication settings on the I O CONFIGURE screen press Shift then Inst Config to get to this screen The message times out after a few seconds and the output destination is changed to CRT by the program ERROR 173 IN XXXX Active system controller req where XXXX represents a line number Indicates that the Test Set s internal IBASIC computer must be set as a system controller for some reason This usually indicates that the Printer Port field of the TESTS Printer Setup screen was set to Agi lent IB but the Mode field on the I O CONFIGURE screen is set to Talk amp Lstn instead of Cont rol Change the mode setting to Control and run the diagnostic again 68 S3agilente8285ALR Book chapterswrouble fm Time outs Troubleshooting Frequently Encountered Diagnostic Messages Certain failures may cause a frequency or voltage reading to time out that is the time required for the measurement will be unreasonably long If a timeout occurs measurement execution will stop and an error message will be displayed If frequency or voltage readings have been successfully made before the timeout the assembly currently being tested or a multiplexer on the Measurement assembly may be at fault If most measurements fail the Reference assembly may be s
212. ta is first generated by the Controller and then passed on tothe Display Driver figure 8 28 on page 290 The Display Driver converts the digital information into analog vertical and horizontal drive signals for the display The Display Driver drive also provides brightness and contrast signals for the display 287 Memory SBRC Instrument Control Section Figure 8 26 Block Diagrams OL 1084 514 8 31 avss ayog aoLvInd3Y 01 lt 33 01 ssng 5uss SUSAR 24685 AE 934 YSDVNVW AYSLLVE ag SV3W WOHJ jHgs sv3MW LOOLSSIL 207D 7934 11 10 3ILVTOA NON NON USSUSISHY 7402 0969 JHES AYOWAW 8 Widas VINIS 288 S agilent e8285 ALR Book chapters blockdiag fm Block Diagrams Instrument Control Section Controller Figure 8 27 01 08 3 OL AV I3Q 91 Sng Sv3W 182 Sng q31v5 508 IDY 1415 Sng Ody 83 00 0 24 2 YOSIANAdNS WON 9 1 10 8 010342 DISNOD AlddNS u3ao aqa sna Dvsqa aa 440 13538 Sng8 q31v5 2vSQ 33005349 ML XnH Sn8 93775 S520 SHOW 0 253 S8ZLLWd3 Voda Nuva 508 L SSIMS E uo Pe ZHWOZ ZHWOZ ZHWOY E 00006521 28989 020893 aaao ay Su dv3H
213. ternal audio generator provides the modulation source Two setups are shown below The first setup can measure signals to 1 GHz Since the FM generator in the Test Set translates FM in the lower band directly into the 1 7 to 2 GHz range testing to 1 GHz is adequate when verifying a repair The second setup has a microwave converter which covers the full measurement range of FM signals to 2 GHz Setup for Measurements to 1 GHz Measuring Receiver GE D moocaoa na O n 0 nj 80000 80000 20080 9 Setup for Measurements to 2 GHz Using Microwave Converter Measuring Receiver 146 INPUT 500 On 20000 80000 Microwave Converter IF OUTPUT RF INPUT LO INPUT D RF OUTPUT UPLEX OUT Signal Generator S agilent e8285 ALR Book chapters perf_test fm Procedure NOTE Performance Tests RF Generator FM Distortion Performance Test 1 Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set Steps 1 2 and 3 in the following procedure apply to both of the setups shown in fi
214. tics pass and the front panel keys and knob work you can assume that the digital control assemblies work 2 After power up the top line of the Test Set s display should show copyright information and the firmware revision code The second line should display All self tests passed Ifthe Test Set powers up with One or more self tests failed Error code lt hexadecimal error code gt see Reading Front Panel or GPIB Codes on page 51 See Frequently Encountered Diagnostic Messages on page 68 for other error messages that might appear on the second line of the display 3 The CDMA CALL CONTROL screen should be displayed Two conditions cause a different screen to be displayed on power up 48 S agilent e8285 ALR Book chapters trouble fm Troubleshooting Self Test Diagnostics SAVE RECALL register named POWERON was saved to automatically power up the Test Set in a different state Press the Preset key before proceeding this will restore the Test Set to the factory power up condition The Autostart Test Procedure on Power Up field of the TESTS Execution Conditions screen is set to On to automatically run a loaded program Press the Shift key then press the Cancel key to stop the program Press the Preset key to restore the Test Set to the factory power up condition To turn the autostart function off press the Tests key then select Execution Cond under SET UP TEST SET heading The autostart fu
215. tly into the 1 7 to 2 GHz range testing to 1 GHz is adequate when verifying a repair The second setup has a microwave converter which covers the full measurement range of FM signals to 2 GHz Initial Setup Figure 6 5 Setup for Measurements to 1 GHz Ges Measuring Receiver 85 888 s 0 lo oal O n 0 aj 80000 90000 900001 paasa INPUT 509 DUPLEX OUT Figure 6 6 Setup for Measurements to 2 GHz Using a Microwave Converter Measuring Receiver INPUT 209 DUPLEX OUT Microwave Converter RF INPUT Signal Generator IF OUTPUT LO INPUT RF OUTPUT 152 S agilent e8285 ALR Book chapters perf_test fm Procedure NOTE Performance Tests RF Generator FM Flatness Performance Test 3 Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set Steps 1 2 and 3 in the following procedure apply to both of the setups shown in figure 6 5 and figure 6 6 on page 152 1 On the measuring receiver a Reset the instrument b Set the measurement mode to FM If the microwave converter is being used set the frequency offset mode to e
216. to Card Set the Select Procedure Filename field to DNLDCAL PresstheK 1 key to run the test 10 Follow theinstructions on the screen 86 S3agilente8285ALRBook chapters disassembly fm Disassembly and Replaceable Parts Disassembly Procedures Disassembly Procedures This section provides instructions for disassembling the Test Set The procedures provided in this chapter are mainly organized in sequential order of Test Set disassembly For component and assembly part numbers refer tothe Parts List on page 105 The callouts for the parts used in the following illustrations are the same as their descriptions in the parts list External and Internal Covers 1 Remove the rear bumpers two screws secure each bumper See Figure 3 1 2 Remove the strap handles STRAP_HANDLE from the Test Set 3 Slide the external cover from the front frame 4 Toaccess the top side assemblies remove the screws securing the top internal covers and remove it See Figure 3 2 on page 88 5 Toaccess the bottom side assemblies remove the screws securing the bottom internal cover and remove it See Figure 3 2 on page 88 Figure 3 1 Cover Removal BUMPER REAR COVER_EXTERNAL TRIM_STRIP_2 TRIM_STRIP_1 Qty 2 AY STRAP_HANDLE 87 Disassembly and Replaceable Parts Disassembly Procedures Figure 3 2 Top and Bottom Internal Covers 5 4 0 105 DIGITAL_CVR Qty 20 RF_COVER SMM4 0_10SEMPNTX Qty
217. uency based on the firmware revision see NOTE above from the Performance Test Record h Set the Amplitude to 10 dBm 163 Performance Tests RF Generator Harmonics Spectral Purity Performance Test 6 3 Set the Test Set s RF generator to the frequencies and levels shown in the Performance Test Record PTR and measure the second and third harmonics For each measurement convert the harmonic level to dB below the fundamental dBc and compare the computed levels to the limits 164 S agilent e8285 ALR Book chapters perf_test fm Performance Tests RF Generator Spurious Spectral Purity Performance Test 7 RF Generator Spurious Spectral Purity Performance Test 7 Setup Figure 6 12 Procedure NOTE The purpose of this test is to verify that the Test Set meets the specification limits in Performance Test Record table 7 7 RF Generator Spurious Spectral Purity Test 7 Record on page 221 Spurious signals with the carrier set to several frequencies and two different levels maximum output and minimum level vernier are searched for by an RF spectrum analyzer Spectrum Analyzer INPUTS DUPLEX OUT Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set 1 Set up the spectrum
218. up Figure 6 31 Procedure DUPLEX OUT Sector B Power DUPLEX OUT AWGN Power 192 The purpose of this test is to verify the amplitude level accuracy of the generator at the DUPLEX OUT port by using the CDMA analyzer to verify it meets the specification limits in PTR Performance Test Record table 7 26 CDMA Generator DUPLEX OUT Sector B Power Level Accuracy Test 26 Record on page 244 CDMA Generator Modulation Accuracy Test 26 8 04001 11 8 88 00000 90000 poaaj 3 0000 6 Peo 9 98 RF IN OUT DUPLEX OUT 1 Press Preset Select the CONFIGURE screen and set the RF Display field to Freq Set the Gen 1 field to 0 MHz Set the Output Port field to Select the CDMA GENERATOR CONTROL screen Set the Scrt A Pwr field to Set the RF Gen Freqto 840 MHz 90 ee lt 9 29 Set the Scrt B Pwr field to the values listed in the for Sector B See Appendix Table 7 26 CDMA Generator DUPLEX OUT Sector B Power Level Accuracy Test 26 Record on page 244 9 Go to the CDMA CELLULAR MOBILE TRANSMITTER TEST screen 10 Read the Avg Power average power and record it in the PTR 11 Select the CDMA GENERATOR CONTROL screen 12 Set the Sector B Power field to Off S agilent e8285 ALR Book chapters perf_test fm Performance Tests CDMA Generator
219. upply are measured with the internal voltmeter 63 Troubleshooting AF RF and CDMA Diagnostics AF RF and CDMA Diagnostics NOTE NOTE AF Diagnostics NOTE The diagnostics are intended to help in locating the source of catastrophic failures Occasionally a test will fail with the test results being only slightly out of limits Such failures do not necessarily indicate that the Test Set is operating outside of its published specifications or that it is otherwise faulty Further testing such as running the performance tests will be required in such cases Many of the internal diagnostic and calibration procedures use low level latch commands to control the instrument settings Many latch settings persist even through a preset They can only be reset by an instrument power down or by explicitly reseting each latch This phenomenon is the reason the message Direct latch write occurred Cycle power when done servicing is displayed the first time a latch is written to Because latch settings persist problems can arise in running these programs For example prematurely terminating a test in a diagnostic using the Pause and Exit keys and restarting another test may cause failures in that test because of improper latch settings It is best to run tests to completion before starting another one Also be sure to cycle the power off and on when done servicing the Test Set This program tests the audio functions of the follow
220. upplying faulty clock signals to the Measurement assembly Re run the test to see if the timeout is intermittent 69 Troubleshooting Manual Troubleshooting Procedures Manual Troubleshooting Procedures NOTE Test Sets with firmware revision A 04 5X and above operate only at RF frequencies from 800 to 1000 MHz and 1700 to 2000 MHz A text only error message Input value out of range will be displayed if invalid frequencies are set If you are not sure a problem exists you should attempt to duplicate the suspected problem This is especially important if the Test Set is being used in a new application where misapplication or incorrect operation of the Test Set may be involved An Agilent 8924C Mobile Station Test Set combined with an Agilent 83236B Cellular Adapter can be used to simulate a high performance CDMA base station and may be useful in attempting to duplicate the problem Refer to following table to determine which diagnostic tests performance tests and periodic self calibration adjustments apply to an assembly Downloading calibration data is discussed in Chapter 6 Performance Tests on page 141 Table 2 2 Relating Assemblies to Troubleshooting Aids mee SERVICE7 Program Diagnostic Performance Periodic Calibration Cal Data ly Name Test P Sub Test Test to Perform Program Needed Keypad Functional Diagnostics Self Test No Display No RF I O RF Diagnostics RF
221. vice damage or destruction Only those who are thoroughly familiar with industry accepted techniques for handling static sensitive devices should attempt to service circuitry with these devices In all instances measures must be taken to prevent static charge build up on work surfaces and persons handling the devices S agilent e8285 ALR Book chapters front fm Contents 1 Introduction Test Get DSC EDDIE 454225345546 tpa Ee popa ca e ur aed 26 Product Descriptio EEG REA dor EH 28 Troubleshooting 36 Repair PF00066 sva sime 9555566 37 Calibration and Performance Verification 38 System Power Calibration 39 Test Equipment Needed for the System Power Calibration Program 40 EB285A Support ContaCts s ERR EXER 41 Hardware and Firmware Enhancements 42 Ordering New 5 43 Troubleshooting How to Troubleshoot the Test Set 46 grip wane 48 Funcional DISOnasEies eas en Ds adn d doc 58 AF RF and COMA Diagnostics nm 64 Frequently Encountered Diagnostic Messages 68 Manual Troubleshooting Procedures
222. ware media which does not execute its programming instructions due to such defects 3 Agilent does not warrant that the operation of Agilent products will be uninterrupted or error free If Agilent is unable within a reasonable time to repair or replace any product to a condition as warranted customer will be entitled to a refund of the purchase price upon prompt return of the product 4 Agilent products may contain remanufactured parts equivalent to new in performance or may have been subject to incidental use 5 The warranty period begins on the date of delivery or on the date of installation if installed by Agilent If customer schedules or delays Agilent installation more than 30 days after delivery warranty begins on the 31st day from delivery 6 Warranty does not apply to defects resulting from a improper or inadequate maintenance or calibration b software interfacing parts or supplies not supplied by Agilent c unauthorized modification or misuse d operation outside of the published environmental specifications for the product or e improper site preparation or maintenance 7 TO THE EXTENT ALLOWED BY LOCAL LAW THE ABOVE WARRANTIES ARE EXCLUSIVE AND NO OTHER WARRANTY OR CONDITION WHETHER WRITTEN OR ORAL IS EXPRESSED OR IMPLIED AND AGILENT SPECIFICALLY DISCLAIMS ANY IMPLIED WARRANTIES OR CONDITIONS OR MERCHANTABILITY SATISFACTORY QUALITY AND FITNESS FOR A PARTICULAR PURPOSE S agilent e8285 ALR Book chapte
223. which best fit the tuning data are calculated using a least squares curve fit The coefficients are then automatically downloaded into the Test Set s non volatile memory 134 sjagilent es285 ALR Book chapters period_adi fm Periodic Adjustments Calibration Setting the Timebase Latches Setting the Timebase Latches The refs_DAC_coarse and ref_DAC_fine values adjust the frequency of the Test Set s internal 10 MHz reference They are stored in memory The controller reads the values and sends the appropriate adjustment to the Reference assembly The following procedure is to be used when running the program Timebase Reference Using a Counter on page 132 1 Press Config key to access the CONFIGURE screen see Figure 5 5 2 CONFIGURE screen select SERVICE the SERVICE screen appears Figure 5 5 SERVICE Screen CONFIGURE Range Hold RF Display RF Level Firmware 11 Frea Chan Offset R 01 26 Hold All StatetAuto RF Chan Std Total RRM MS AMPS 896 kB Notch Coupl Output Port AFGen1 Nonel RATE Serial No RFGen Volts RF Qut 1539090053 dB To Screen Input Atten SERVICE Input Port COMA _ Voltage Im Freauency REV SPEC se O 0000 4 30483 1 4452 im al Alt Pur Ms Voltmeter Connection Clock Cal Bands Confis MEAS 12V REF is None Counter Connection AUDI COUNT Gate Time To Screen Config RAM Initialize all RAM and restart
224. xit the mode 27 0 Special 2 On the Test Set co h i Press Preset Select the CONFIGURE screen Setthe RF Display field to Freq Set the RF Offset to Off Set the Output Port field to Select the RF GENERATOR screen Set the RF Gen Freq field to the appropriate RF frequency based on the firmware revision see NOTE above from the Performance Test Record Set the Amplitude to 10 dBm Set the AFGen1 To fieldto 50 kHz deviation 3 For frequencies up to 1000 MHz measure the FM deviation at the RF frequencies and rates shown in the Performance Test Record PTR Convert the measurement results to dB referenced to the deviation measured at 1 kHz using the following formula and compare the calculated deviation to the limits in the PTR Deviation B 20 log d Ure log at 1 20 The following steps are for measurements to 2 GHz 4 On the signal generator a b Set the frequency to 1500 MHz CW Set the level to 8 dBm or whatever level is suitable for the microwave converter s LO input 153 Performance Tests RF Generator FM Flatness Performance Test 3 5 On the measuring receiver a Set the frequency offset mode to enter and enable the LO frequency 27 3 Special b Key in the LO frequency in MHz which is 1500 6 On the Test Set for frequencies of 1700 and 2000 MHz measure the FM deviation at the rates shown in the PTR Convert the measurement
225. y for removal Figure 3 15 Front Panel Assembly CORE SHIELD BEAD AY NUT HEX DBL CHAM Qty 3 99 Disassembly and Replaceable Parts Disassembly Procedures Figure 3 16 Front Panel Subassemblies DISPLAY_CVR_AY RBN_10CNDCT 28AWG DISPLAY_ KIT WINDOW DISPLY RBN_50CNDCT28AWG CA_ ASSY_SPEAKER CBL_AY_VOL_CONT CX F BNC SMB KNOB ASSY 3 8 KNOB 31_DIA 48 100 s agilent e8285 ALR Book chapters disassembly fm Disassembly and Replaceable Parts Disassembly Procedures Fan 1 Remove the external and internal top covers See External and Internal Covers on page 87 2 Toremove either fan see Figure 3 17 disconnect its power connector to the motherboard and remove the 4 screws securing the fan tothe Test Set chassis Figure 3 17 Fan Removal FAN ASSY SMM4 0 105 Qty 6 REAR PANEL ASSY KIT CHASSIS ASSY 101 Disassembly and Replaceable Parts Disassembly Procedures Power Supply 1 Remove the external and internal top and bottom cover see Figure 3 2 on page 88 2 Remove the 6 screws securing the power supply assembly to the Test Set s chassis see Figure 3 18 3 Refer to Figure 3 19 Power Supply Subassemblies on page 103 and Figure 3 20 Power Supply Assembly Rear Panel on page 104 to identify the desired subassembly for removal Figure 3 18 Power Supply Assembly SMM4 0 105 Qty 6 102 s agilente8285 ALR Book chapte

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