Home

Service Manual

1. FLUKE 41 4001 Sheet 1 of 2 Figure 6 4 Fluke 41 A1 Main PCA 6 17 39 41B Service Manual gt I is gt 25 A J RAE 38 N ZU vs f 3 19 U12 U16 A 5 7 C4 123 R11 KE cig 310 gt E gt lt re 129 En R76 R71 50 R31 ara EAT _ res 258 c49 AS R66 S 6919 5107 p R61 C63 30 oo A De A y R23 R72 75 10 054 E 5 874 Sh Vann a 8 ES N a 2 A 7 LT u 1
2. R82 lt _ Y1 ie ES v 28 no A j R 7 amp 12 B an E g N R21 y 52 f NS k 7 J R20 L1 O O 3 5 g S N FLUKE 41 4001 Sheet 2 of 2 Figure 6 5 Fluke 41 A1 Main PCA cont 6 18 Chapter 1 Schematic Diagrams FIGURE PAGE 7 1 1 Main PCA Fluke 40 41 7 3 Schematics Not Available
3. 4 6 Harmonics Performance for AMPS Harmonics 5 1 Power Supply Current Limits 2 25 SUpp les ea sce es ee cess eene 5 3 Latch Signals for Voltage 6 1 Fluke 40 Final Assembly 6 2 Pluke Al Main PCA WR 0 3 Pinal tte rone 6 4 AI ona Fluke 40 41 Service Manual List of Figures FIGURE 2 1 Overall Functional Block 2 2 PLD Block a eene etae on nana aon a mmm 3 1 Removing the Case Bottom 32 n Cable masussa ape 4 1 Watts Performance Test Configuration 4 2 Battery Removals oon 4 3 Battery Spring Adjustment eene eene eene enne nennen 4 4 Calibration Access Hole cortar re rore RON eaa 5 1 Test POINT Locator dm 6 1 Fluke 40 Final Assembly 6 2 Bluke40 AT Mam POA sopa Re maks sx oo dE Lea Fan i RR ja 6 3 Fluke 41 Emal Assembly recep eek rab Sense 6 4 41 Al Main PCA i da ee donate ed edu vii Fluke 40 41
4. 5 8 Troubleshooting the Keypad 5 9 Troubleshooting the Range Control 4 5 10 Troubleshooting the 5 11 Troubleshooting the LCD Display 5 12 Troubleshooting the Serial EEPROM sene 6 LIST REPLACEABLE 6 1 INTRODUCTION i n eee lama mapa daha PARS 6 2 HOW TO OBTAIN 6 3 MANUAL STATUS INFORMATION il Contents continued 6 4 NEWER 6 3 6 5 SERVICE CENTERS citi nama asu 6 3 6 6 PA RISIEISTS asada 6 3 SCHEMATIC amma amma a nnn nannaa 7 1 iii Fluke 40 41 Service Manual List of Tables TABLE PAGE 2 11 Voltage 2 2 A aeniea ar anes 222 7 Memory 245 Troth 4 1 Recommended Test 4 2 Volts Performance Text 4 3 Amps Performance Text Screen 4 4 Watts Performance Text 4 5 Harmonics Performance for Volts Harmonics
5. SIN 26004 UOISIDAUOI vin 2601017 ELN ueg ein en SHOA Indu SHOA 5 ndul Figure 2 1 Overall Functional Block Diagram 2 4 Theory of Operation 2 Circuit Operation The power supply voltages for the Tester are derived from four cell batteries The 4 to 6 volt dc source generates 6 separate voltage sources to power digital analog and display circuitry The cell batteries typically provide 48 hours of Tester operation The Input Conditioning section filters and controls the amplitude of the incoming signals to the a d converters Signal amplitude is adjusted for maximum dynamic range of the a d converters The anti aliasing filter eliminates any signal components that are more than one half the sampling freguency Without this filter some signals may be interpreted incorrectly There are two a d converters in the Tester One for the volts input and the other for the amps input These a d converters quantize the input signals to digital or numeric values so the Digital Signal Processor DSP in the digital kernel can read and process the information Both converters sample the input signals at a 10 kHz rate The digital kernel is basically a small but fast computer system It has three input sources sample data from the a d co
6. 1 5 67 DOUT AMPS 4X3X2X1X 0 1X2X3X4X 5 6X7X8X 91 NI NIN es e SCK 014 015 13 03 20 A complemented version of SCK coming from the DSP chip e CS AD U14 U15 1 and 03 17 The chip select signal to the A Ds which causes the A Ds to sample and convert the result e DOUT VOLTS UI5 12 or U3 13 The serial data transmitted by the volts A D converter e DOUT AMPS 014 12 03 11 The serial data transmitted by the amps A D converter 5 8 Troubleshooting Troubleshooting the Digital Section Pins 13 and 11 on U3 should show a slightly attenuated version of pin 12 on U15 and 014 If this is not the case verify that the 100 ohm resistors R71 R76 are correct When the instrument is collecting data in normal operation mode the above four waveforms can be observed with the following timing If SCK and CS AD are both correct and present at the A D but the appropriate DOUT VOLTS DOUT AMPS is not correct there is some problem with the front end possibly with the A D converter itself The following problems may indicate a defective U3 e MS 12 bits of DOUT VOLTS followed by the MS 12 bits of DOUT AMPS do not make it through U3 correctly e SCO and SC2 inputs to U3 are correct but 5 output from U3 is not correct e SCK is not an inverted version of SCK Troubleshooting the Keypad 5 8 To isolate a problem
7. Performance Testing and Calibration 4 Calibrating the Tester 2 ME Figure 4 3 Battery Spring Adjustment Note Contact bounce on the Cal Enable pads may advance the Cal Prompt beyond the 20 calibration range In the event this happens turn the Tester off then on and enable calibration again 5 With the instrument in an upright position the Cal Enable switch pads are in the largest and leftmost hole Figure 4 4 Using a small flat blade screwdriver or equivalent blunt tipped conductive object short together the two Cal Enable pads The calibration mode is enabled when the Tester displays the CAL AMP PROBE INPUT menu and calibration factors A command arrow on the left of the display should point to the APPLY VRMS instruction line 6 Reinstall the battery access lid on the instrument See Figure 4 2 The display also provides information for the RANGE that is being calibrated the voltage to APPLY to the Tester inputs and the resulting calibration FACTOR All ranging is automatically taken care of by the Tester and only the calibration voltage needs to be supplied 4 13 39 41B Service Manual Figure 4 4 Calibration Access Hole Making Calibration Adjustments 4 17 The calibration step being performed is identified by an arrow on the left side of the display Each step calls for either a connection to be made or a known voltage applied to the input of the Tester Pressing Enter will either move to the nex
8. Before starting to troubleshoot make sure the batteries are fresh enough to meet the minimum power supply voltages specified in Table 5 2 Starting with a Dead Tester 5 3 When the Tester is turned on the display should come up in either the waveform harmonics or text screen mode If it does not it is possible that someone left the display contrast very low causing the display to be blank To eliminate this possiblity hold down while pressing 0 and then release both buttons If the Tester still appears dead the problem could be in the power supplies or power on circuit the digital kernel or the display module itself Use the appropriate procedure below to isolate the problem 5 3 5 4 39 41B Service Manual 015 16 VREF 014 Pin 9 VCC Junc C63 and T1 AMPS SGND AMPS IN 5107 Euro vss U17 Pin 9 PWR_SW2 R87 Pin 2 PWR_SW1 R38 Ro ERE t 01 ci BU m R26 Pin 1 50 VEE 025 Pin 7 e
9. with a relative humidity of less than 70 Once adjusted to the environment turn on the Tester and allow it to warmup for at least 2 minutes Checking the Display Pixels 4 5 To check the Tester s diplay pixels press and hold 2 The Tester displays a uniform checkerboard pixel pattern Visually check the pixel pattern for missing pixels When done release 2 and the Tester will start normal operation Note The following procedures are based on using two calibrators a phase meter and a dual channel signal generator Other test equipment configurations may require some adjustments in the performance tests and calibration procedures described in this chapter Testing Voltage Performance 4 6 Perform the following procedure to test the voltage function of the Tester Warning Ensure that the calibrator is in standby mode before making any connection between the calibrator and Tester dangerous voltages may be preSent on the leads and connectors 1 Connect a cable from the Output Voltage and LO connectors of calibrator A to the V and COM connectors on the Tester Press until the text screen is displayed Press until V is diplayed in the upper right corner of the display Press 3 2 until V is displayed in the top status line of the Tester play pe m Set the output of calibrator A to the values in Table 4 2 The settings in the table must be done twice Once with a frequency of 0 Hz for the
10. 2 ns ANNAN AN 6 20 Min Max 210 52 Min Max CS BOOTROM Min 150 Min 41 Min 130 Min d 15 Min Max V 67 Max 15 Min Max 10 15 Min Max 5 05 Min Max 5 05 Min Max AD 232 84 Min Max 0 7274 229 84 Min Max 0 Min 90 Max DATA y Y If the signals CS_LCD and LCD E are not correct verify that they are produced correctly by U3 When attempting to read and write to the display the observed timing should match the LCD timing diagrams If the inputs to U3 A15 A14 AS A4 RD WR XY PS are all present there may be a problem with U3 Vertical lines across the LCD screen will most likely be due to a misalignment of the LCD glass with its elastomeric connector Replace the LCD display module to fix this problem To isolate a problem where the LCD display contrast does not adjust correctly proceed as follows 1 Press the arrow keys to verify that when entering contrast the WIPER on the EEPOT U8 5 can be moved between the top wiper voltage U8 3 of 3 3V and the bottom wiper voltage U8 6 of 0V The right arrow moves the wiper toward the top wiper voltage or increases the contrast and the left arrow moves the wiper toward the bottom wiper position or decreases the contrast The newly selected value of contrast does not get saved unless you specifically exit the contrast
11. 2 8 Q 2 9 2 0 2 9 1 Processor U2 Programmable Logic 0 0 0 SRAM US UG NIA NO BackLight Contrast Control EEPOT 09 2 1 39 41B Service Manual 2 2 2 42 2 43 Optical Interface Model 41 Only Transmitter tester RE ee ipe khe Receiver Theory of Operation D Introduction Introduction 2 1 Chapter 2 provides circuit descriptions for the Fluke 40 Power Harmonics Meter and Fluke 41 Power Harmonics Analyzer First the Tester is described in general terms with a Functional Block Description Then each block is detailed further with Detailed Circuit descriptions Schematic diagrams are provided in Chapter 7 A signal name followed by an asterisk is active asserted low A signal name not followed by an asterisk is active high Functional Block Description 2 2 The Tester is unlike most Fluke handheld meters All waveforms and readings are based on hundreds of measurements instead of a few integrate cycles used in most DMMs The 128 points used to display waveforms are not directly sampled but are synthesized using several hundred measurements This approach allows the instrument to be more flexible and display a wider range of data such as time and frequency domain data Using sampled data for watts and RMS values instead of traditional analog measurement techniques reduces cost size and power
12. SUPPORT INTERNAL 936815 CASE BOTTOM OVERMOLDED 936831 HOOK 936810 SPRING BATTERY 936906 COVER BATTERY OVERMOLDED 936807 ACCESSORY PACK 936851 ACCESSORY PACK RS232 936856 CLAMP AC CURRENT 936943 HOLDER LED 937011 CONN ELASTOMERIC KEYPAD PWB 1 350L 942805 SHOCK ABSORBER 948708 LABEL ADHES MYLAR 1 50 312 943407 SOFTWARE FLUKEVIEW 41 936880 TRANSITOR PHOTO W DAYLIGHT FILTER 942540 THERMISTOR POS 1 1K 20 25 C 867192 MODULE KEYPAD 936745 FLUKE 40 41 USERS MANUAL ENGLISH 942847 FLUKE 40 41 USERS MANUAL INTL 942854 FLUKE 40 41 QUICK REFERENCE CARD 942862 801 5005 INSTRUCTION SHEET ENGLISH 936922 801 5005 INSTRUCTION SHEET SPANISH 948534 801 5005 INSTRUCTION SHEET GERMAN 948539 801 5005 INSTRUCTION SHEET FRENCH 948542 CABLE FLAT 24COND 1 MMSP 1 30 936992 CONTACT BATTERY 936752 REFERENCE DESIGNATOR N asa lt 1 1 N O 0 N 2 LL LES AE A Ny o mb 40 L imb 0L LE DAC CADO NOTES STATIC SENSITIVE PARTS 1 ACCESSORY PACK INCLUDES THE FOLLOWING ITEMS MP1 TEST LEAD SI R A STRT BANANA RED TL24 927798 1 2 TEST LEAD SI R A STRT BANANA BLK TL24 927793 1 MP3 PROBE TEST BANANA JACK RED TP20 927777 1 MP4 PROBE TEST BANANA JACK BLK TP20 927772 1 MP5 CLIP ALLIGATOR BANANA SAFETY RED AC20 927582 1 MP6 CLIP ALLIGATOR BANANA SAFETY BLK AC20 ACCESSORY PACK INCLUDES THE FOLLOWING ITEMS W1 CABLE RS
13. Service Manual viii a ONO Chapter 1 Introduction and Specifications Title Page SS 1 dini Bene Organization of the Service Manual SNT General Information tti rtr ete tee E EE Iesse Power 001 0001 eene Options Accessories and Related Eguipment Operating Instructions Specifications 39 41B Service Manual 1 2 Introduction and Specifications 1 Introduction Introduction 1 1 This service manual provides information on maintaining troubleshooting and repairing the Fluke 40 Power Harmonics Meter and Fluke 41 Power Harmonics Analyzer The information in this manual pertains to both models unless otherwise indicated The Fluke 40 and 41 share many features and are collectively referred to as the Tester Model 4 is mentioned when a description pertains to that model only This manual includes the following e Specifications e Theory of operation e Calibration procedure e Performance testing and troubleshooting procedures e Replacement parts lists e Schematic diagrams A meter under warranty will be promptly repaired or replaced at Fluke s option and returned at no charge See the registration card for warranty terms If the warranty has expired the meter will be repaire
14. To avoid shock you must make sure the battery cover is installed 1 Connect the calibrator HI and LO outputs to the Clamp Probe BNC connector on the Tester Press 92 A voltage source is used to calibrate the current input DO NOT APPLY A CURRENT SOURCE TO THE BNC CONNECTOR 2 Apply 14 mV rms at 60 Hz After allowing the reading to settle press on the Tester 3 Apply 140 mV rms at 60 Hz After allowing the reading to settle press on the Tester 4 Apply 1 4V rms at 60 Hz After allowing the reading to settle press on the Tester 5 Press to start gain factor calibration 6 Apply 14 mV rms at 60 Hz After allowing the reading to settle press on the Tester 7 Apply 140 mV rms at 60 Hz After allowing the reading to settle press on the Tester 8 Apply 1 4V rms at 60 Hz After allowing the reading to settle press on the Tester 9 Press to switch to the Voltage calibration display The Tester displays VOLTS INPUT for voltage calibration 10 Disconnect the calibrator from the Clamp Probe BNC connector Connect calibrator HI and LO outputs to V and COM inputs of the Tester Press 592 Warning Dangerous voltages will be present on the calibration source and connecting cables during the following steps Ensure that the calibrator is in standby mode before making any connection between the calibrator and Tester 11 Apply 175V rms at 60 Hz After allowing the reading to settle press on the Te
15. sese Starting with a Dead sss Troubleshooting the Power Supply sese Troubleshooting the Digital Troubleshooting the Digital Troubleshooting the A D Converter Output Troubleshooting the Keypad Troubleshooting the Range Control Circuit Troubleshooting the Troubleshooting the LCD Display Troubleshooting the Serial 39 41B Service Manual 5 2 Troubleshooting Introduction Introduction 5 1 This chapter describes troubleshooting procedures that can be used to isolate problems with the Tester These procedures deal primarily with the digital section of the Tester Due to the simplicity of the Analog section only theory of operation is provided to support analog troubleshooting When troubleshooting the Tester follow the precautions listed on the Static Awareness sheet to prevent damage from static discharge Signal names followed by are active asserted low Signal names not so marked are active high General Troubleshooting 5 2 Caution To avoid contaminating the pca with oil from your fingers handle the pca by its edges or wear gloves A contaminated pca may not cause immediate instrument failure in controlled environments Failures typically show up when contaminated units are operated in humid areas
16. 0 W VA to 600 kW kVA average 0 W VA to 2000 kW kVA peak Accuracy ac dc Active W 1 4 digits probe specs Harmonics Measurement Accuracy Cursor Data Harmonic Level gt 5 Using Smooth 20 Volts Fundamental to 13th Harmonic 2 2 digits 13th to 31st Harmonic 13th 2 2 digits 31st 8 2 digits 1 6 Introduction and Specifications 1 Specifications Amps or Watts Fundamental to 13th Harmonic 3 3 digits probe specs 13th to 31st Harmonic 13th 3 3 digits probe specs 31st 8 3 digits probe specs lt 20A add 3 digits Phase Fundamental 2 degrees probe specs 2nd to 31st Harmonic 2nd 5 degrees 31st 20 degrees probe specs Freguency Measurement Accuracy Fundamental 6 0 Hz 99 9 Hz 6 0 Hz 99 9 Hz 0 3 Hz Other Measurement Specifications Input Bandwidth 0 5 dB DC 5Hzto2 1 kHz Crest Factor CF Range 1 00 to 5 00 Power Factor PF 0 00 to 1 00 Displacement Power Factor DPF 0 00 to 1 00 Phase Measurement Range 179 to 180 degrees K Factor Range Model 41 1 0 to 30 0 Total Harmonic Distortion THD F 0 0 to 799 9 THD R 0 0 to 100 0 General Specifications Size 9 2 x 3 9 x 2 5 inches 234 x 100 x 64 mm Weight 2 0 Ibs 1 kg Input Connectors Voltage 2 shrouded banana jacks 4 mm Current Probe 1 shrouded BNC jack Battery Type 4 Alkaline
17. 100PPM MELF 944244 20 21 RES CERM 499K 1 1W 100PPM MELF 929922 22 RES CERM 680K 5 125W 200PPM 1206 929901 26 RES CERM 6 2K 5 125W 200PPM 1206 746016 27 RES CERM 1K 5 125W 200PPM 1206 745992 31 RES CERM 510K 5 125W 200PPM 1206 746800 37 RES CERM 47K 5 125W 200PPM 1206 746685 RES CERM 10 5K 1 125W 100PPM 1206 851852 42 RES CERM 200 1 125W 100PPM 1206 772798 43 RES CERM 27K 5 125W 200PPM 1206 740530 45 RES CERM 1K 1 125W 100PPM 1206 783241 46 RES CERM 620K 5 125W 200PPM 1206 811919 47 RES CERM 6 98K 1 125W 100PPM 1206 929919 48 RES CERM 17 8K 1 125W 100PPM 1206 929930 49 RES CERM 24 9K 1 125W 100PPM 1206 867689 50 RES CERM 29 4K 1 125W 100PPM 1206 929935 52 RES CERM 37 4K 1 125W 100PPM 1206 867486 53 RES CERM 20K 1 125W 100PPM 1206 927421 54 RES CERM 3 3 5 125W 400PPM 1206 867502 57 RES CERM 220K 5 125W 200PPM 1206 746750 58 RES CERM 1M 1 125W 100PPM 1206 836387 RES CERM 10 5 125W 200PPM 1206 746214 61 RES CERM 12 1K 1 125W 100PPM 1206 930032 62 RES CERM 2 74K 1 125W 100PPM 1206 930156 64 RES CERM 205K 1 125W 100PPM 1206 769836 65 RES CERM 215K 1 125W 100PPM 1206 836643 67 RES CERM 15M 5 125W 300PPM 1206 811968 RES CERM 4 7K 5 125W 200PPM 1206 740522 RES CERM 0 05 MAX 125W 1206 810747 RES CERM 100 5 125W 200PPM 1206 746297 RES CERM 220 5 125W 200PPM 1206
18. 1206 RES CERM 220 5 125W 200PPM 1206 RES CERM 47 5 125W 200PPM 1206 RES CERM 49 9K 1 0 1W 100PPM 0805 RES CERM 12 1 1 0 1W 100PPM 0805 INDUCTOR 100UH 20 0 51ADC INDUCTOR 200UH 20 0 36ADC FLUKE STOCK NUMBER 876524 769281 746628 740548 740548 740548 746610 746610 944244 929922 929901 867291 746016 745992 783241 929898 746800 810747 810747 772780 746685 740522 851852 772798 811919 929919 929930 867689 929935 867486 927421 867502 801423 746750 836387 746214 930032 930156 769836 836643 811968 746297 746347 746263 928697 930081 929729 929732 List of Replaceable Parts 6 Cp 4 lt N W A A A N 4 4 Aaa anon np a ae enn nnn nn DN 6 15 39 41B Service Manual Table 6 4 Fluke 41 A1 Main PCA cont FLUKE DESCRIPTION STOCK NUMBER C CMOS OCTAL D F F EDG W 3 ST SOIC 929869 C DIGITAL SIGNAL PROC LV 24 BIT PQFP 929740 LOGIC DEVICE PROGRAMMED 936885 EPROM PROGRAMMED 937024 C CMOS SRAM 32K X 8 LO 25 5 5028 929799 IC CMOS EEPOT 1K OHM 32 TAPS LO V SO8 929786 AMP FET PREC LOW PWR SNGL 5 508 929828 IC CMOS EEPROM LV 32K X 8 250 NS PLCC 929737 C CMOS QUAD BILATERAL SWITCH SOIC 875232 C CMOS 10 BIT A D W SAMPLE HOLD SOIC 929070 AMP DUAL PICOAMP IB SO8 910836 C CMOS TIMER LOW POWER SO8 930151 20 21 25 AMP DUAL LOW POWER SOIC 867932 22 IC EEPROM SERIAL 64 X 16 LO V SO8 92980
19. 2 2 FUNCTIONAL BLOCK DESCRIPTION eee 2 3 CIRCUIT OPERATION brevia 2 4 Power Up 2 5 Normal Oper FAKE n eas ine 2 6 CIRCUIT 8 2 7 Power Supplies eroe tate idei eese deesse saas 2 17 Input 2 24 AUD CONVEO S gate ito 2 25 saattaa 2 37 A 2 38 Display 2 42 Optical Interface Model 41 GENERAL 3 1 3 2 3 3 3 4 INTRODUCTION WARRANTY REPAIRS AND SHIPPING INFORMATION GENERAL MAINTENANCE INFORMATION enm Required Equipment Fluke 40 41 Service Manual 3 5 Static Safe Handling 3 05 5 3 7 DISASSEMBLING THE TESTER eene 3 8 Removing the Meter Case Bottom 2 1 2 3 9 Removing the PCA and Input Module sese 3 10 Removing the LCD 3 11 Removing the Elastomeric Keypad eene 3 12 REASSEMBLING THE TESTER eere 3 13 Installing the PCA and Input Module eee 3 14 Reassembling the Case 4 PERFO
20. 20 Test Probes 2 e AC 20 Test Clips 2 The following additional accessories are supplied with the Fluke 41 e RS 232 Cable e 9 Pinto25 Pin Adapter e Plug Adapter e 3 5 inch Micro Floppy Disk FlukeView 41 Software Optional accessories for both the Fluke 40 and 41 are as follows e 801 10005 AC Current Probe e 415 Soft Carrying Case Operating Instructions 1 8 Operating instructions for the Fluke 40 and 41 can be found in the Users Manual Fluke PN 942847 See How to Obtain Parts on page Error Reference source not found 1 1 39 41B Service Manual Specifications 1 9 Accuracy is specified for a period of one year after calibration Freguency Range Fundamental 6 65 Hz and dc Minimum Input Levels SV rms rms Volts Measurements True RMS Input Range 5 0V to 600V rms ac dc 5 0V to 933V peak Basic rms ac dc 0 5 2 digits peak dc 2 3 digits lt ISV RMS add 2 digits Input Impedance 1 balanced Crest Factor gt 3 0 below 300 1 56 600V Amps Measurements True RMS 1 mV A Isolated Input Input Range 1 00 mV A to 1000 mV rms A ac dc 1 0 mV A to 2000 mV A peak Basic Accuracy rms dc 0 5 3 digits probe specs peak dc 2 4 digits probe specs Input Impedance 1 47 pF Crest Factor gt 3 0 below 600 mV 2 0 1000 mV Watts Measurements Volt Amps 1 mV A Isolated Input Range
21. 746347 RES CERM 47 5 125W 200PPM 1206 746263 RES CERM 49 9K 1 0 1W 100PPM 0805 928697 RES CERM 12 1 1 0 1W 100PPM 0805 930081 INDUCTOR 100UH 20 0 51ADC 929729 INDUCTOR 200UH 20 0 36ADC 929732 C CMOS OCTAL D F F EDG W 3 ST SOIC 929869 C DIGITAL SIGNAL PROC LV 24 BIT PQFP 929740 LOGIC DEVICE PROGRAMMED 936885 EPROM PROGRAMMED 937024 C CMOS SRAM 32K X 8 LO V 25 5 5028 929799 IC CMOS EEPOT 1K OHM 32 TAPS LO V SO8 929786 AMP FET PREC LOW PWR SNGL 5 508 929828 C CMOS QUAD BILATERAL SWITCH SOIC 875232 REFERENCE DESIGNATOR A A D 4 4 4 4 4090 on sz O N N R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R T T U U U U U U U U a D a ap a lt 6 8 List of Replaceable Parts 6 Table 6 2 Fluke 40 A1 Main PCA cont FLUKE DESCRIPTION STOCK NUMBER C CMOS 10 BIT A D W SAMPLE HOLD SOIC 929070 AMP DUAL PICOAMP IB SO8 910836 C CMOS TIMER LOW POWER SO8 930151 C OP AMP DUAL LOW POWER SOIC 867932 IC EEPROM SERIAL 64 X 16 LO V SO8 929802 1 5 TO 5V CONVERTER SWTCH 508 929844 REF SHUNT 1 2 V 2 150 PPM SOT23 929489 IC VOLTAGE REF 2 5V 0 4 25PPM SO8 929831 CONVERTER CHARGE PUMP 100 508 929851 1 VOLT REG PWM STEP DOWN ADJ SO8 942953 C VOLT REG FIXED 5V UPOWR LO DO SO8 929190 ZENER UNCOMP 22V 5 5 6MA 0 2W
22. 942862 936922 948534 948539 948542 936992 936752 List of Replaceable Parts 6 a a o ae kom A A A A A J AR 6 5 39 41B Service Manual Figure 6 1 Fluke 40 Final Assembly 6 6 DUVDIDIIIDDAAOAOOOO ON 0070 TT REFERENCE DESIGNATOR 1 6 14 19 2 3 73 4 8 5 7 13 15 16 18 20 24 26 32 34 44 48 50 54 56 58 60 62 9 17 25 33 45 47 49 53 51 52 68 71 57 61 63 67 70 72 64 66 69 15 17 19 4 9 12 6 8 10 11 16 18 20 1 5 9 14 30 51 2 10 3 11 4 13 6 15 7 44 74 8 12 16 34 35 Table 6 2 Fluke 40 A1 Main PCA DESCRIPTION CAP CER 750PF 1 50V C0G 0805 CAP CER 1000PF 1 50V C0G 1206 CAP CER 100PF 1 50V C0G 0805 CAP CER 0 1UF 10 25V X7R 1206 CAP CER 8200PF 20 50V X7R 0805 CAP CER 20PF 10 50V C0G 1206 CAP CER 47PF 10 1000V C0G 1808 CAP TA 1UF 20 35V 3528 CAP CER 0 01UF 20 100V X7R 1206 CAP CER 330PF 5 50V C0G 0805 CAP CER 0 22UF 80 20 50V Y5V 1206 CAP CER 0 015UF 20 50V X7R 0805 CAP TA 100UF 20 10V 7343 CAP TA 10UF 20 16V 6032 CAP CER 470PF 10 50V C0G 1206 CAP CER 47PF 10 50V C0G 1206 DIODE SI SCHOTTKY 30V SOT 23 DIODE SI SCHOTTKY DUAL 30V SOT 23 DIODE SI BV 70 0V 10 50MA DUAL SOT23 DIOD
23. C Cells ANSI NEDA 14A IEC LR14 supplied Operating Time 24 Hours minimum 48 Hours typical continuous operation Alternate Battery 4 NiCad Cells customer supplied and externally charged The Tester prevents battery reversal by turning itself off if battery voltage drops below 4 0V dc Temperature Operating 0 to 50 C 32 to 122 F Storage 20 to 60 C 4 to 140 F Temperature Coefficient 0 1 x Specified Accuracy per C 0 to 18 28 to 50 39 41B Service Manual Humidity noncondensing Operating 0 30 C 90 30 409 75 40 509 45 Storage 90 Altitude Operating 10 000 feet 3 km Storage 40 000 feet 12 km Shock amp Vibration per MIL T 28800 class 3 sinusoidal non operating Electro Magnetic Compatibilty RF Emissions EN 50081 1 Commercial Limits VFG 243 1991 RF Susceptibility EN 50082 1 Commercial Limits Council Directive Electromagnetic Compatibility Directive 89 336 EEC Drip Proof and Dust Proof Case per IEC 529 Section 3 IP 52 Dust Protected Drip Proof Display Type Super Twisted Liquid Crystal Size 3 0 inch diagonal 76 mm Resolution 160 W x 128 H pixels Contrast User adjustable Backlight Yellow green LED Safety Designed for 600V measurements on industrial power distribution circuits Overload Protection Voltage or Current Probe Input 600V maximum Surge Protection 6 kV per IEC 1010 1 Maximum Voltage Isolation to Earth 600 from any terminal Pro
24. CR3 is correct and installed properly 9 Check that MODE A U2 121 is high when reset U2 125 goes from low to high If it is not high check that IRQA is pulled high and U3 9 is not driving IRQA low If U3 is driving IROA low when reset is active verify that the reset line to U3 2 is high when reset is active If U3 2 1s high while reset 1s active and U3 is still driving IRQA low then U3 may be bad 10 Check for activity on the CS SRAM and CS BOOTROM lines When the DSP reset line is released the DSP should start reading 1536 bytes starting at boot ROM address p C000 On power up the DSP is set to 15 wait states for all memory locations thus CS BOOTROM is asserted low and should have a width of approximately 450 ns Next there should be a short pause a few milliseconds as the DSP executes the loaded code Finally the DSP copies all code from boot ROM to SRAM Since the first 512 words of SRAM is onchip no external SRAM activity will be observed until the onchip SRAM is full While copying the remaining code to external SRAM CS BOOTROM should be an active low pulse of approximately 310 ns when reading from the EPROM and CS SRAM should be an active low pulse of approximately 70 ns when writing to external SRAM The timing of the signals associated with reading the boot ROM or reading writing to the SRAM should be compared with the following timing diagrams 5 6 Troubleshooting Troubleshooting the Digital Section ns
25. ES 8 09 at 08 P3 Pin 1 Reset Q3 coll Figure 5 1 Test Point Locator 22 Vdc U25 Pin 4 Troubleshooting Troubleshooting the Power Supply Troubleshooting the Power Supply 5 4 After pressing 0 check the power supply voltages against the supply range values in Table 5 2 If the power supplies do not come on the problem could be with the power on circuit itself The following technigue can be used to force the power supply on even when the DSP or power on circuit is defective Refer to Figure 5 1 for test point locations in the following steps 1 To ensure the Tester is not drawing too much current remove the batteries and connect a 5 volt supply that indicates supply current between VBT and VBT 2 Turn on the power supply If the current draw with the Tester power off is greater than 0 5 mA check the power supply capacitors C48 and C61 for shorts 3 Short SW1 SW2 together with a jumper while monitoring the amp meter on the supply If the current draw exceeds the High Limit level in Tabl
26. a component MOS devices can fail when exposed to static fields as low as 30V 3 3 39 41B Service Manual Follow these two rules for handling static sensitive devices 1 Handle all static sensitive components at a static safe work area Use grounded static control table mats on all repair benches and always wear a grounded wrist strap Handle boards by their nonconductive edges only Store plastic vinyl and Styrofoam objects outside the work area 2 Store and transport all static sensitive components and assemblies in static shielding bags or containers Static shielding bags and containers protect components and assemblies from direct static discharge and external static fields Store components in their original packages until they are ready for use Cleaning 3 6 Warning To avoid electrical shock or damage to the tester never allow water inside the case To avoid damaging the tester s housing never apply solvents to the meter When the Tester requires cleaning wipe it with a cloth that is lightly dampened with water or a mild detergent Do not use aromatic hydrocarbons chlorinated solvents or methanol based fluids when wiping the Tester Disassembling the Tester 3 7 The following paragraphs describe how to disassemble the Tester to the pca level Start and end your disassembly at the appropriate heading levels Caution Always remove the case bottom first to avoid damaging the Tester Removing the Meter C
27. amplitude and phase angle readings displayed by the Tester are within the minimum and maximum limits listed in Table 4 5 Table 4 5 Harmonics Performance for Volts Harmonics Screen HP 3245A Settings Fluke Performance Limits Channel A Output Tester Amplitude Freguency Harmonic Amplitude Cursor KI O IN am 9 a s mm wo e 9 Testing Harmonics Amps Performance 4 12 1 2 Press until is displayed in the top status line of the Tester 3 Press until 206 is displayed in the top status line of the Tester v 15 N above the upper right corner of the harmonics display 4 9 39 41B Service Manual 4 Connect channel A output of the HP 3245A to the V and COM connectors on the Tester 5 Connect channel B output of the HP 3245A to the Current Probe connector on the Tester 6 Setupchannel A of the HP 3245A to the following values and leave these settings the same for the duration of this test Note The voltage output setting of the HP 3245 is always a peak to peak value V 20 00V Freguency 60 Hz lt shift gt Phase Angle 0 lt shift gt Phase Sync lt enter gt Note The last entry for the HP 3425A settings must be lt shift gt lt Phase Sync gt lt enter gt 7 Set the HP 3425A channel output volts amplitude frequency and phase angle to the values in Table 4 6 and move the Tester cursor to the corresponding harmonic number Note The la
28. and Tester dangerous voltages may be preSent on the leads and connectors 1 Connect the equipment as shown in Figure 4 1 Calibrator A should have a range of 5V to 100V ac and calibrator should have a range of 35 mV to 1 4V ac 2 Set the output amplitude from the calibrators to the values in Table 4 4 3 Enable the Phase Lock mode on calibrator 4 Using the Phase Shift function on calibrator A adjust the phase to within 0 5 degrees of the phase shift specified in Table 4 4 4 7 39 41B Service Manual 4 8 and VAR KVAR readings are within the minimum and maximum limits specified i in Table 4 4 6 Press until the Tester is in the Harmonics screen mode Verify that the fundamental frequency phase angle readings are between the minimum and maximum readings listed in Table 4 4 Table 4 4 Watts Performance Text Screen Calibrator Outputs Performance Limits VAR KVAR Phase Model 41 Harmonics oo o2 195 us s ms a Foor amo s Testing Record Mode Performance 4 9 1 Using the equipment setup from the previous performance test apply the last set of values from Table 4 4 to the Tester 2 Press and then 322 Max Avg and Min screens for correct readings according to Table 4 4 Testing Memory Mode Performance Model 41 Only 4 10 1 Using the eguipment setup from the previous performanc
29. feature by pressing 3 For example if the Tester is in the contrast mode and you turn the power off the contrast setting will not be saved as the new contrast of the display If moving the WIPER through its range of values does not change the contrast of the display there may be a problem with the analog contrast circuit or a problem with the LCD module Verify that U3 is producing the correct INC EEPOT and CS EEPOT signals as shown in the following timing diagram EE UPLOW U8 2 controls the direction that the WIPER will move CS EEPOT 08 7 selects the EEPOT When the CS EEPOT signal goes from low to high thus deselecting the EEPOT the present value of the EEPOT is saved to nonvolatile memory and will be used as EEPOT s default value upon receiving power Once the EEPOT is selected INC EEPOT U8 1 is pulsed low to increment decrement the wiper position in accordance with the EE UPLOW line If the signals EE UPLOW CS EEPOT and INC EEPOT are correct to U8 but the wiper does not move or the part does not save the result U8 be defective If the CS EEPOT or the INC EEPOT signals are not generated properly verify that all the correct signals are present U3 A15 A14 A5 4 RD WR XY PS If they are U3 may be defective Troubleshooting Troubleshooting the Digital Section DSPCLCK 5 LCD 1 INC CS EEPOT Troubleshooting the Serial EEPROM 5 12 A faulty serial E
30. is generated by 023 and 012 U23 works by charging C65 to 6 6V dc from pin 8 of U23 and then inverts C65 and places it in parallel with C64 012 assures that VDD is up before VSS is applied to the analog circuitry VREF 2 14 The reference voltage for the two a d converters is generated by U28 Z5 and U24 U28 provides 2 5V dc 0 4 which is divided into 2 1154V dc by Z4 U24 buffers the reference voltage 2 1154V dc for use by the a d converters and their input dividers 2 7 39 41B Service Manual 2 8 Low Battery Detection 2 15 The low battery detection circuit monitors the battery voltage and sends a signal to the microcontroller when the battery voltage falls below 4 22 volts R49 and R53 set the reference for the circuit to 1 47 volts R52 and R30 divide the battery voltage down to stay within the common mode range of the op amp R58 provides hysteresis to prevent oscillations LOW BAT goes low when the battery drops below its minimum value Power Reset 2 16 Various parts of the digital circuitry reguire a power reset signal to initialize their operation upon power up 026 and 019 monitor the VCC power supply When the VCC voltage goes above 2 7 Volts O19 turns on This causes O17 to turn off and allows C46 to start charging When the voltage across C46 reaches 1 8V dc 02 turns on pulling the RESET signal low Because both senses of the reset signal are needed 03 inverts the RESET signal and provides the signal RES
31. sometimes hard to debug since they look like a black box from the outside In the case of the Fluke 40 41 U3 is broken into six relatively simple sections Several of the sections share com mon inputs Figure 2 2 is a block diagram of the internal circuits of the PLD Keypad Interrupts 2 28 The four row signals R0 3 from the keypad are ANDed together If any of the signals drop below a valid high state IRQA is driven low This generates an interrupt to the DSP so that the software does not have to continually scan the keypad inputs until an interrupt is detected Theory of Operation D Circuit Descriptions RD DSPCLOCK LCD KEYBOARD INTERRUPTS INTERFACE RO R1 CS LCD R2 MEMORY EE DECODE INC EEPOT AND CS EEPOT CS GAIN EEPOT INTERFACE CS EEPROM CS BOOTROM CS SRAM SERIAL DOUT AMPS SHIFT MUX REGISTER SCK DOUT VOLTS DOUT EESER CHL ATOD EESER ATOD EESER CS EESER Figure 2 2 PLD Block Diagram Memory Decoding 2 29 The signals A15 A14 A5 A4 PS DS XY and WR are used to map out the SRAM EPROM EEPROM Gain Latch EEPOT and LCD in program and data space Although the SRAM looks like one contiguous RAM space it s actually divided into three separate memory spaces Table 2 3 shows where external memory and I O are mapped Table 2 3 Memory Map X Data Space Y Data Space Program Space SRAM U7 5 B000 BFFF 8000 BFFF
32. 0200 2FFF 8800 sFFFF 0 e m 39 41B Service Manual Table 2 4 is a truth table for the selection of the various devices in the Tester Table 2 4 Logic Truth Table KT K KI ET SIS suu jossa of sum fossam e Erom os eerom t eeror 1 eeror oseeror 1 OS GAN o Interface to LCD Module 2 30 The LCD module requires a clock sync signal that synchronizes all read and write operations It signals the display module that all address data and control signals are valid with an active high state This signal is generated from U2 signals WR RD DSPCLOCK and CS LCD This generated signal is active high during a read write operation between the DSP and the LCD module Shift Register 2 31 The amps and volts readings are sampled simultaneously to avoid phase errors The a d data for both input channels is transferred to the DSP over a single serial port The PLD shift register stores an amps data point while the DSP is reading the associated volts data point After the volts data point has been read into the serial port the data from the shift reg
33. 100 ns 200 ns 300 ns 6 20 263 15 0 15 Address Bus DS PS XY DS PS X Y 15 Min Max 250 Min Max 15 Min Max CS BOOTROM 285 46 Min Max 5 05 plis 125 Min Max 281 96 Min Max pus ns CLOCK 26 32 N 6 20 Min Max Min Max 0 15 DS PS Address Bus DS PS XY 15 11 Min CS SRAM Min Max 25 Min E Min Max ja 5 05 Min Max 48 63 Min Max RD A 45 13 Min Max If these signals are not correct verify that the appropriate signals A15 A14 A5 A4 RD WR XY PS are present and correct If these signals are not correct you may have a problem with the DSP chip U2 If these signals are correct you may have a problem with U3 Troubleshooting the A D Converter Output 5 7 To isolate a problem with the a d converters proceed as follows 1 Check that 5 0 SC2 SCK and SRD at U2 are correct e 5 0 02 29 labeled controls which A D converter is being read e SC2 U2 32 labeled FSO Generates one bit pulse at the start of each A D word and it occurs at twice the sample rate of an A D converter e SCK 02 31 labeled SCK Bit clock rate of the A D converters e SRD U2 38 labeled DOUT serial data received from the MUX in U3 When the instrumen
34. 2 23 1 5 TO 5V CONVERTER SWTCH 508 929844 26 C V REF SHUNT 1 2 V 2 150 PPM SOT23 929489 28 IC VOLTAGE REF 2 5V 0 4 25PPM SO8 929831 29 CONVERTER CHARGE PUMP 100 MA SO8 929851 C VOLT REG PWM STEP DOWN ADJ SO8 942953 IC VOLT REG FIXED 5V UPOWR LO DO SO8 929190 ZENER UNCOMP 22V 5 5 6MA 0 2W SOT 23 831230 CRYSTAL 3 86918MHZ 50PPM SURFACE MT 929716 RES CERM SOIC 14 PIN 13 RES 47K 2 929864 RES CERM SOIC 14 PIN 13 RES 30K 2 930003 RES MF SOIC 8 PIN 4 RES 2K 1 929963 RES MF SOIC 8 PIN 4 RES CUSTOM 929968 RES NET THK FILM TESTED 900576 REFERENCE DESIGNATOR U U U U U U U U U U U U U U U U U U U U lt D DN N CO N N CO 4 lt lt lt N NNN N lt NOTES STATIC SENSITIVE PARTS 6 16 List of Replaceable Parts 6 Es ved 042
35. 2 and C68 VRI controls this voltage to 22V dc This is necessary because there is no feedback to U19 A feed forward path R61 helps control the supply voltage as the battery voltage changes The duty cycle changes which causes the frequency of the boost circuit to change from 88 to 140 kHz as the battery voltage changes from 4V to 6V dc The LCD supply is controlled by the microcontroller through signal LCD PWR which when high turns U19 on VEE 2 11 The VEE supply controls the contrast of the LCD U8 is an EEPOT that is controlled by the microcontroller The voltage appearing at the wiper pin is buffered by an op amp part of U25 The other half of U25 is used as a difference amplifier to sum the wiper signal with a voltage which is temperature sensitive The temperature sensitive voltage comes from Q18 which is biased as a diode and has a temperature sensitivity of 2 2 mV degree The default for contrast is 16 6V dc with a range of 15V dc minimum contrast to 18 5V dc Maximum contrast VDD 2 12 The 5V dc supply is generated by first doubling the VCC supply U29 CR4 C69 and C67 form the voltage doubler circuit Capacitor C69 is charged to VCC minus one diode drop when the CAP terminal of U29 goes to ground When the CAP terminal goes to VCC the sum of the voltage across C69 and VCC is applied to C67 through the second diode in CR4 U31 isa low dropout 5 volt regulator VSS 2 18 The negative analog supply VSS
36. 200PPM 1206 RES CERM 15K 5 125W 200PPM 1206 RES CERM 100K 5 125W 200PPM 1206 RES CERM 10K 5 125W 200PPM 1206 RES CERM 470 1 1W 100PPM MELF RES CERM 499K 1 1W 100PPM MELF RES CERM 680K 5 125W 200PPM 1206 RES CERM 11K 1 125W 100PPM 1206 RES CERM 6 2K 5 125W 200PPM 1206 RES CERM 1K 5 125W 200PPM 1206 RES CERM 1K 1 125W 100PPM 1206 RES CERM 464K 1 125W 100PPM 1206 RES CERM 510K 5 125W 200PPM 1206 RES CERM 0 05 MAX 125W 1206 RES CERM 150 1 125W 100PPM 1206 RES CERM 47K 5 125W 200PPM 1206 RES CERM 4 7K 5 125W 200PPM 1206 RES CERM 10 5K 1 125W 100PPM 1206 RES CERM 200 1 125W 100PPM 1206 RES CERM 620K 5 125W 200PPM 1206 RES CERM 6 98K 1 125W 100PPM 1206 RES CERM 17 8K 1 125W 100PPM 1206 RES CERM 24 9K 1 125W 100PPM 1206 RES CERM 29 4K 1 125W 100PPM 1206 RES CERM 37 4K 1 125W 100PPM 1206 RES CERM 20K 1 125W 100PPM 1206 RES CERM 3 3 5 125W 400PPM 1206 RES CERM 1 33K 1 125W 100PPM 1206 RES CERM 220K 5 125W 200PPM 1206 RES CERM 1M 1 125W 100PPM 1206 RES CERM 10 5 125W 200PPM 1206 RES CERM 12 1K 1 125W 100PPM 1206 RES CERM 2 74K 1 125W 100PPM 1206 RES CERM 205K 1 125W 100PPM 1206 RES CERM 215K 1 125W 100PPM 1206 RES CERM 15M 5 125W 300PPM 1206 RES CERM 100 5 125W 200PPM
37. 232 936872 1 CP1 ADAPTER D SUB 9 PIN D SUB 25 SCKT 929187 1 CP2 ADAPTER D SUB 25 PIN D SUB 25 PIN 867940 1 6 12 List of Replaceable Parts 6 SEE VIEW B BLACK RED RED J1 SEE VIEW BLACK J2 Figure 6 3 Fluke 41 Final Assembly 6 13 39 41B Service Manual Table 6 4 Fluke 41 A1 Main PCA FLUKE DESCRIPTION STOCK NUMBER 1 6 14 CAP CER 750PF 1 50V C0G 0805 867643 19 867643 2 3 73 CAP CER 1000PF 1 50V C0G 1206 867668 4 8 CAP CER 100PF 1 50V C0G 0805 867650 5 7 13 CAP CER 0 1UF 10 25V X7R 1206 747287 15 16 18 747287 20 24 26 747287 32 34 44 747287 48 50 54 747287 56 58 60 747287 62 747287 9 CAP CER 8200PF 20 50V X7R 0805 942516 10 CAP CER 2700PF 20 50V X7R 0805 930149 11 12 52 CAP CER 0 22UF 80 20 50V Y5V 1206 740597 68 71 740597 17 25 CAP CER 20PF 10 50V C0G 1206 747345 33 CAP CER 47PF 10 1000V C0G 1808 930235 45 47 CAP TA 1UF 20 35V 3528 866970 49 53 CAP CER 0 01UF 20 100V X7R 1206 742981 51 CAP CER 330PF 5 50V C0G 0805 512038 57 CAP CER 0 015UF 20 50V X7R 0805 493916 61 63 67 CAP TA 100UF 20 10V 7343 929877 70 72 929877 64 66 69 CAP TA 10UF 20 16V 6032 867572 74 CAP CER 470PF 10 50V C0G 1206 747360 CAP CER 47PF 10 50V C0G 1206 747352 DIODE SI BV 70 0V IO 50MA DUAL SOT23 742320 742320 DIODE SI SCHOTTKY 30V SOT 23 930060 DIODE SI SCHOTTKY DUAL 30V SOT 23 929745 DIODE SI 30 PIV 1 1 AMPS SCHOTTKY
38. 4V 100 0 1 74 9 900500 26 C sco s AE PRINT seno Phase Meter Signal Figure 4 1 Watts Performance Test Configuration Performance Testing and Calibration 4 Performance Tests 7 Press 7 01 until is displayed in the top status line of the Tester play 8 Setthe output of calibrator to the values contained in Table 4 3 The settings in the table must be done twice Once with a frequency of 0 Hz for the DC readings and again at 60 Hz for the RMS and PK readings Note Apply the voltage incrementally so the Tester does not autorange to the next higher range Ensure the Tester is in the appropriate range before checking the reading against the performance limits 9 Verify the readings are within the minimum and maximum limits specified in Table 4 3 Note It is normal for the tester to display OL THD with a VDC input Table 4 3 Amps Performance Text Screen Calibrator Performance Limits E T PE 1368 Testing Watts VA VAR Performance 4 8 Perform the following procedure to test the watts VA and VAR functions of the Tester Output Fluke 40 41 mV ac 60 Hz Warning Ensure that the calibrator is in standby mode before making any connection between the calibrator
39. 782573 DIODE SI BV 75V 10 250MA SOT23 830489 FERRITE CHIP 95 OHMS 100 MHZ 3612 867734 CONN FLAT FLEX 1MM CTR RT ANG 24 POS 929893 SOCKET SINGLE PWB FOR 0 026 0 033 PIN 811539 1 6 8 TRANSISTOR SI NPN SMALL SIGNAL SOT 23 742676 2 3 18 TRANSISTOR SI NPN SMALL SIGNAL SOT 23 912469 15 17 19 912469 4 9 12 TRANSISTOR SI N DMOS FET SOT 23 927538 10 TRANSISTOR SI P MOS 60V SOT 23 867606 11 TRANSISTOR SI NPN BIASED SC 59 942912 16 18 20 TRANSISTOR SI PNP 50V 0 2W SOT 23 820910 21 TRANSISTOR SI PNP SMALL SIGNAL SOT 23 742684 1 5 9 RES CERM 20K 5 125W 200PPM 1206 746644 14 30 51 746644 2 10 RES CERM 75K 1 125W 100PPM 1206 867085 3 11 RES CERM 121K 1 125W 100PPM 1206 867437 4 13 RES CERM 36 5K 1 125W 100PPM 1206 929906 REFERENCE DESIGNATOR og a O N N N 2 NAMA 0 DVUVMDOOOOOO OO v vr 6 14 R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R R T T REFERENCE DESIGNATOR 6 15 7 44 74 8 12 16 34 35 40 55 60 63 72 17 19 24 66 75 18 23 38 20 21 22 25 26 27 28 32 45 29 31 38 70 82 84 36 37 Table 6 4 Fluke 41 A1 Main PCA cont RES CERM 226K 1 125W 100PPM 1206 RES CERM 36K 5 125W
40. BATTERY 1 5V 0 480MA ALKALINE SIZE C SCREW PH P THD FORM STL 4 14 375 SCREW PH P THD FORM STL 5 14 812 JUMPER INPUT RED JUMPER INPUT BLK WINDOW DECAL CASE TOP LCD MODULE 160X128 GRAPH TRNSFLECTIVE MODULE INPUT OVERMOLDED CASE BOTTOM OVERMOLDED SUPPORT INTERNAL HOOK SPRING BATTERY COVER BATTERY OVERMOLDED ACCESSORY PACK CLAMP AC CURRENT CONN ELASTOMERIC KEYPAD TO PWB 1 350L SHOCK ABSORBER LABEL ADHES MYLAR 1 50 312 THERMISTOR POS 1 1K 20 25 C MODULE KEYPAD FLUKE 40 41 USERS MANUAL ENGLISH FLUKE 40 41 USERS MANUAL INTL FLUKE 40 41 OUICK REFERENCE CARD 801 5005 INSTRUCTION SHEET ENGLISH 801 5005 INSTRUCTION SHEET SPANISH 801 5005 INSTRUCTION SHEET GERMAN 801 5005 INSTRUCTION SHEET FRENCH CABLE FLAT 24COND 1MMSP 1 30 CONTACT BATTERY 4 O 0 gt N 1400 L ON NOTES STATIC SENSITIVE PARTS 1 ACCESSORY PACK INCLUDES THE FOLLOWING ITEMS MP1 TEST LEAD SI R A STRT BANANA RED TL24 927798 1 MP2 TEST LEAD SI R A STRT BANANA BLK TL24 927793 1 MP3 PROBE TEST BANANA JACK RED TP20 927777 1 MP4 PROBE TEST BANANA JACK BLK TP20 927772 1 MP5 CLIP ALLIGATOR BANANA SAFETY RED AC20 927582 1 MP6 CLIP ALLIGATOR BANANA SAFETY BLK AC20 927579 1 FLUKE STOCK NUMBER 948786 423582 448456 942946 936877 937040 936963 936849 928296 936836 936844 936815 936810 936906 936807 936851 936943 942805 948708 943407 867192 936794 942847 942854
41. DC readings and again at 60 Hz for the RMS and PK readings Note Apply the voltage incrementally so the Tester does not autorange to the next higher range Ensure the Tester is in the appropriate range before checking the reading against the performance limits 6 Verify that the readings are within the minimum and maximum limits specified in Table 4 2 4 4 Performance Testing and Calibration 4 Performance Tests Table 4 2 Volts Performance Text Screen V ac 60 Hz and V dc 129 2 132 9 205 Testing Amps Performance 4 7 Perform the following procedure to test the amps funtion of the Tester Warning Ensure that the calibrator is in standby mode before making any connection between the calibrator and Tester dangerous voltages may be preSent on the leads and connectors Press and turn on the Tester to enter the Setup screen Using and lt gt select OTHER for Clamp Setting Press to exit the Setup screen Connect a cable from the Output Voltage HI and LO connectors of calibrator to the Current Probe connector on the Tester me CA Press until the text screen is displayed on the Tester 6 Press 2 until i is displayed in the upper right corner of the display 39 41B Service Manual 4 6 Phase Lock In Variable Phase Out Calibrator 5V 100V Output HI O 00 Calibrator 30 mV 1
42. E SI 30 PIV 1 1 AMPS SCHOTTKY DIODE SI BVz75V IOZ250MA SOT23 FERRITE CHIP 95 OHMS 100 MHZ 3612 CONN FLAT FLEX 1MM CTR RT ANG 24 POS SOCKET SINGLE PWB FOR 0 026 0 033 PIN TRANSISTOR SI NPN SMALL SIGNAL SOT 23 TRANSISTOR SI N DMOS FET SOT 23 TRANSISTOR SI NPN SMALL SIGNAL SOT 23 TRANSISTOR SI P MOS 60V SOT 23 TRANSISTOR SI NPN BIASED SC 59 TRANSISTOR SI PNP 50V 0 2W SOT 23 RES CERM 20K 5 125W 200PPM 1206 RES CERM 75K 1 125W 100PPM 1206 RES CERM 121K 1 125W 100PPM 1206 RES CERM 36 5K 1 125W 100PPM 1206 RES CERM 226K 1 125W 100PPM 1206 RES CERM 36K 5 125W 200PPM 1206 RES CERM 15K 5 125W 200PPM 1206 RES CERM 100K 5 125W 200PPM 1206 FLUKE STOCK NUMBER 867643 867643 867668 867650 747287 747287 747287 747287 747287 747287 747287 942516 747345 930235 866970 742981 512038 740597 493916 929877 929877 867572 747360 747352 930060 929745 742320 782573 830489 867734 929893 811539 912469 912469 927538 742676 867606 942912 820910 746644 746644 867085 867437 929906 876524 769281 746628 740548 List of Replaceable Parts 6 O O N O mc N D 01 N lt lt N 6 7 39 41B Service Manual Table 6 2 Fluke 40 A1 Main PCA cont FLUKE DESCRIPTION STOCK NUMBER 40 55 60 X 740548 63 72 N 740548 17 19 24 RES CERM 10K 5 125W 200PPM 1206 746610 66 75 N 746610 18 23 38 RES CERM 470 1 1W
43. EPROM U4 immediately after coming out of reset 5 The DSP activates the power on signal U2 19 to a high state about 20 ms after coming out of reset 6 The remaining instrument operating code about 11 5K words 34 5K bytes is downloaded from the EPROM 04 to the SRAM U5 6 7 This should take about 70 ms or be complete about 100 ms after initial power up 7 While the code is being downloaded a checksum is being calculated If the checksum is correct U2 17 goes high If there is a problem downloading the program the unit powers itself off at this point 2 5 39 41B Service Manual 2 6 8 About 140 ms after the power button is first pressed a checkerboard test pattern appears on the LCD if the power button is held down during power up When the button is released the instrument resumes normal operation Normal Operation 2 5 The normal seguence is as follows 1 The Tester simultaneously samples volts and amps inputs and stores the samples in SRAM 2 U2 calculates the results using algorithms stored in the program section of SRAM The results are stored in SRAM as well 3 The calculated results are displayed on the LCD The software determines which mode the instrument is in and displays the corresponding screen and information This entire sequence takes about 300 ms that is it repeats about three times per second During normal operation the instrument always operates in this sequence with one exc
44. EPROM circuit is indicated if the Tester displays CALIBRATION ERROR after the Tester has been calibrated and the power has been cycled off on To further isolate the problem proceed as follows 1 Display the power up configuration screen by holding and pressing 0 multiple menu items are highlighted on a line or no menu items on a given line are highlighted the serial EEPROM U22 is probably faulty Note In the next step the Fluke 40 will not display the baud rate or printer type 2 Reset the instrument to factory default by holding and pressing 0 Then power the Tester off and back on to bring up the power up configuration screen The following menu items should be highlighted VOLT WAVE RMS 801 5005 VOLT 9 6K and EPSON If these menu items are not highlighted the serial EEPROM U22 may be defective Note The serial EEPROM signals will be active just after the last step is completed in the power up configuration screen 3 When the serial EEPROM U22 is read from or written to the following conditions should be present e CS EESER should be low U22 1 e SCK line U22 2 should be changing states at slightly less than a 500 KHz rate e Data written to the serial EEPROM U22 3 should be the same as U2 33 line labeled DIN e Data read from the serial EEPROM U22 4 should be the same as the data supplied to the processor U2 38 If the data on U22 4 and U2 38 are not the same but the ATOD EE U3 12
45. ET Input Conditioning 2 17 Both the voltage and current inputs provide gain adjustments and filtering of the incoming signal before it is sent on to the a d converters Difference Amplifier Voltage Input 2 18 010 and Z6 form a difference amplifier The difference amplifier improves the instruments operation on three phase delta power systems It also provides isolation and a protective impedance in both the high and common inputs The gain of the amplifier is 1 500 Protection Circuit Current Channel 2 19 RTI R38 R18 R23 R17 Q6 and Q7 form a protection circuit to limit the input voltage and current applied to U18 during accidental overvoltages The emitter of Q7 clamps any input voltage to 10 Volts R17 further limits the current into the input of U18 to 500 uA Gain Amplifier 2 20 Both the voltage and current inputs adjust the gain based on the range selected There are three hardware ranges for each input 256 512 and 1024 volts peak for the voltage input and 20 200 and 2000 Amps peak for the current input The ranges for the current input assume that the input is 1 mV Amp The gain for both inputs are controlled by the microcontroller through a latch U1 Resistor networks Z4 amp Z7 are ratio matched to 0 196 with the resistor between pins 1 and 8 as the reference Latch 01 2 21 The latch U1 controls the switches that select the gain for both the amps and volts input stages The switches controll
46. FLUKE 40 41 POWER HARMONICS METER ANALYZER Service Manual PN 942826 June 1994 K 1994 Fluke Corporation Inc All rights reserved Printed in U S A Fluke 40 41 Service Manual LIMITED WARRANTY amp LIMITATION OF LIABILITY Each Fluke product is warranted to be free from defects in material and workmanship under normal use and service The warranty period is one year and begins on the date of shipment Parts product repairs and services are warranted for 90 days This warranty extends only to the original buyer or end user customer of a Fluke authorized reseller and does not apply to fuses disposable batteries or to any product which in Fluke s opinion has been misused altered neglected or damaged by acci dent or abnormal conditions of operation or handling Fluke warrants that software will operate sub stantially in accordance with its functional specifications for 90 days and that it has been properly recorded on non defective media Fluke does not warrant that software will be error free or operate without interruption Fluke authorized resellers shall extend this warranty on new and unused products to end user cus tomers only but have no authority to extend a greater or different warranty on behalf of Fluke War ranty support is available if product is purchased through a Fluke authorized sales outlet or Buyer has paid the applicable international price Fluke reserves the right to invoice Buyer for impo
47. OSSES INCLUDING LOSS OF DATA WHETHER ARIS ING FROM BREACH OF WARRANTY OR BASED ON CONTRACT TORT RELIANCE OR ANY OTHER THEORY Since some countries or states do not allow limitation of the term of an implied warranty or exclu sion or limitation of incidental or consequential damages the limitations and exclusions of this war ranty may not apply to every buyer If any provision of this Warranty is held invalid or unenforce able by a court of competent jurisdiction such holding will not affect the validity or enforceability of any other provision Fluke Corporation Fluke Europe B V P O Box 9090 P O Box 1186 Everett WA 98206 9090 5602 B D Eindhoven The Netherlands CHAPTER 1 Table of Contents INTRODUCTION AND I INTRODUCTION 2 2 2 2 kal 1 2 ORGANIZATION OF THE SERVICE 1 3 CONVENTIONS hkm are hat aa ik 1 4 GENERAL 1 5 breui n hae 1 6 Power Requirements ec sea eta Dies 1 7 Options Accessories and Related 1 8 Operating 5 1 93 SBECIEICA TIONS nama munaa maama naa kaat nsa THEORY OF OPERATION naan n a pKa n 2 1 INTRODUGTION sirio did
48. PRNT in the upper left corner of the display and the following message appears PRINTING PRESS ANY KEY TO STOP 7 To confirm the send function press the Send button and confirm the Tester displays SEND in the upper left corner of the display Calibrating the Tester 4 14 The Tester allows closed case calibration using known reference sources The meter automatically prompts you for the required reference signals measures them calculates the correction factors and stores the correction factors in the nonvolatile calibration memory The Tester has a normal calibration cycle of 1 year If the Tester fails the performance test or has been repaired it should be calibrated To meet the instrument specifications listed in Chapter 1 the Tester should be calibrated with equipment meeting the minimum specifications given in Table 4 1 Introduction 4 15 The Tester is calibrated using the calibration screen Two factors are used to correct each a d converter reading offset and gain AC voltages are used as inputs to both the offset and gain calculations During the offset measurement the instrument calculates the DC value of the AC input This insures that the DC values reported when AC is present are correct 2 x Advalue x GSF Offset is the calibrated value Advalue is the present reading from the a d converter GSF is the gain scale factor and Offset is the value from the calibration sequence The basic c
49. RMANCE TESTING AND CALIBRATION 4 1 INTRODUCTION 4 2 REQUIRED 4 3 PERFORMANCE 5 68 2 4402 0 1 0101000 00001 4 4 Warming Up the 4 5 Checking the Display Pixels 4 6 Testing Voltage Performance 4 7 Testing Amps Performance 4 8 Testing Watts VA VAR 4 9 Testing Record Mode Performance 4 10 Testing Memory Mode Performance Model 41 Only 4 11 Testing Harmonics Volts Performance 4 12 Testing Harmonics Amps Performance 4 13 Testing Serial I O Performance Model 41 Only 4 14 CALIBRATING THE TESTER eren eene 4 15 Introd cti n 1 4 16 Entering Calibration 4 17 Making Calibration Adjustments eene 5 TROUBLESHOOTING 5 1 5 2 GENERAL TROUBLESHOOTING eee 5 3 Starting with a Dead Tester eese 5 4 TROUBLESHOOTING THE POWER 0 5 5 TROUBLESHOOTING THE DIGITAL SECTION 5 6 Troubleshooting the Digital 1 5 7 Troubleshooting the A D Converter
50. SOT 23 831230 CRYSTAL 3 86918MHZ 50PPM SURFACE MT 929716 RES CERM SOIC 14 PIN 13 RES 47K 2 929864 RES CERM SOIC 14 PIN 13 RES 30K 2 930003 RES MF SOIC 8 PIN 4 RES 2K 1 929963 RES MF SOIC 8 PIN 4 RES CUSTOM 929968 RES NET THK FILM TESTED 900576 NOTES STATIC SENSITIVE PARTS REFERENCE DESIGNATOR U U U U U U U U U U U lt D DN N lt p lt N N NNN N lt 6 9 39 41B Service Manual jos S C33 AS S xm N gt 3 N R37 C25 N N E lt gt 17 a N EZ C46 5 gt H 5 S B U22 08 IF R7 N 225 E30 5 LE R86 R87 e 5 0 d B RZY a R43 a R50 ce R44 121 R5
51. alibration consists of sets of steps for Volts banana jacks and Amps BNC inputs Both inputs are calibrated using an AC Volt Reference Source Caution Do not apply current sources to the Tester s Clamp Probe BNC connector The entire calibration process must be completed before the new calibration factors can be stored in nonvolatile memory If the calibration process is discontinued prior to completion no changes are made to nonvolatile calibration memory 39 41B Service Manual Entering Calibration Mode 4 16 To put the Tester in the calibration mode and display the calibration screen proceed as follows 1 Allow the Tester to stabilize in an environment with an ambient temperature of 18 to 28 degrees Celsius and relative humidity of less than 70 for at least four hours Note The Cal Enable switch is located in the battery compartment of the instrument beneath a calibration seal 2 Remove the Tester s battery access lid and batteries Figure 4 2 Remove the calibration seal to reveal the calibration access hole Figure 4 2 Battery Removal 3 In order for the Tester to remain on while replacing the battery door remove the battery shunt spring and reinsert it with the spring s straight edge on the battery side of the plastic wall Figure 4 3 Place four fresh cell batteries in the Tester taking care to ensure proper polarity 4 Press to turn the Tester on and allow it to warm up for at least 2 minutes
52. are handheld Testers used to measure voltage and current at power line and harmonic freguencies Using these inputs the Tester automatically calculates power and a wide range of other measurements useful in determining harmonic distortion levels and sources These capabilities allow you to monitor power guality before and after an installation troubleshoot a power distribution system and with Model 41 print out or download data for additional analysis The Tester 15 both a harmonics measurement tool and power meter or digital multimeter You can use the Tester to measure voltage events undervoltage overvoltage line outages and neutral to ground levels current levels or to measure power levels Fundamental freguency measurements to 100 Hz and harmonic freguency measurements to about 2 kHz are also possible Power Reguirements 1 6 The Tester uses 4 Alkaline Cells ANSI NEDA 14A IEC LR 14 for primary power New Alkaline Cells will provide a minimum of 24 hours of continuous operation typically 48 hours You can also use NiCad batteries however depending on battery condition fully charged NiCad batteries provide 8 hours or less of continuous operation Options Accessories and Related Eguipment 1 7 1 4 The following accessories are supplied with the Fluke 40 and 41 e 801 5005 AC Current Probe e TL 24 Test Leads Set of two Red and Black Introduction and Specifications General Information e
53. ase Bottom 3 8 Perform the following procedure to remove the case bottom Figure 3 1 1 Make sure the Tester is disconnected from any live source turned off and all test leads are removed from the input module 2 Remove the two slotted screws on the battery cover one 1s located under the hook and remove the cover Remove the batteries 4 Remove the six Phillips screws from the case bottom Insert a thin non sharp object e g credit card or plastic tuning tool between the case bottom and the input module and gently pry the case bottom away from the input module Figure 3 1 When the seal between the case bottom and the input module breaks the case bottom will free itself 8 4 General Maintenance 3 Disassembling the Tester Figure 3 1 Removing the Case Bottom Removing the PCA and Input Module 3 9 Caution To avoid contaminating the pca with oil from your fingers handle the pca by its edges or wear gloves A contaminated pca may not cause immediate instrument failure in controlled environments Failures typically show up when contaminated units are operated in humid areas After you have removed the case bottom use the following procedure to remove the and input module 1 Before removing the board from the case top disconnect the flex cable from the board by pulling out the connector latch from the connector body Figure 3 2 The latch remains attached to the connector body 2 Pullthe input mod
54. atio matched to 0 196 with the resistor between pins 1 and 8 as the reference A D Converters 2 24 The two a d converters are 10 bit successive approximation converters One measures volts and the other measures amps These parts use serial interfaces to communicate to the DSP through U3 s serial Multiplexer section When CS AD goes low the a d converter starts a conversion cycle CS stays low during each conversion cycle During the conversion cycle 12 bits are read by the microcontroller The a d converter sends the two Least Significant Bits twice The data is sent Most Significant Bit first The a d converter sample rate is 10 076 kHz and the clock rate is 241 824 kHz Resistor R71 is needed to limit the current between the a d converter and the microcontroller because the a d converter operates at 5 volts while the microcontroller operates at 3 3 volts 2 9 39 41B Service Manual Digital Kernel 2 25 The digital kernel consists of a digital signal processor a programmable logic device PLD ROM and RAM It processes the input signals from the a d converters computes the values and waveforms and stores the data in RAM for the display Digital Signal Processor U2 2 26 The DSP56002 processor DSP has full control of all hardware in the Tester It controls a d sampling computations serial interface user interface and the display The DSP has several I O ports that can be configured in a number of different
55. consumption The entire digital section operates on 3 3 volts which saves power and generates less Radio Frequency Interference RFI Refer to Figure 2 1 during the following functional block descriptions Tester has seven basic sections e Power Supplies e Input Conditioning e Analog to Digital a d Conversion e Digital Kernel Computer e Keypad e Display e Optical Interface Fluke 41 only 2 3 39 41B Service Manual eyeq pue 7700 sn 9 INVHS 8180 en WYHS Jejnduio AJUO Ly eni 27910 ZN 8X2 INVHS 1009 8x79 5 eyeq pue 8xyce INOud33 LLN bL OY 91 N vz vk OW SL 627910 8 sng eieq 8 ez00 61 09 9 Jeisibeg HUS en JosseooJg eubis jeibig 2009545 en jeues 91601 wieg eldsiq 9INPOW 01 Jonuo2 18811400 10d33 Lg exniJ SO LO 9HO 120 jeondo seiyddng In PZSLNIbZ 011400 ueg zen renes eig 82 INOHd33
56. crocontroller goes low Q21 turns on and the current through CR6 is set by the resistor R36 and the voltage across CR6 The current through CR6 should be 11 mA at ambient Receiver Q5 is a photo transistor used to receive the signal provided by the Fluke 41 s RS232 cable It senses the infrared light from the infrared LED 1n the optional interface cable When an infrared light source is on Q5 begins to conduct harder which turns on Q1 Q1 provides the necessary current gain to interface the received signal with the microcontroller U20 provides a variable collector supply voltage to Q5 R25 and C10 filter the signal at the collector of Q1 The DC value of the signal is compared with the diode voltage of CR1 U20 integrates the error voltage and sets the voltage at the collector of Q5 C11 is an additional filter for the collector voltage of Q5 The voltage at the collector of Q5 is 2V dc with no light and should go to OV dc if light is shown continuously on Q5 UY UY UY UY UY WWW WWW W O 0 JAN UD Chapter 3 General Maintenance instans keitin ema ORTI HERR aN Warranty Repairs and Shipping Information General Maintenance Information esee Required Equipment esses eene Static Safe R INS iia Diada Disassembling the ener Removing the Met
57. d and returned for a fixed fee Contact the nearest Service Center for information and prices A list of U S and International Service Centers 1s included at the end of Chapter 6 of this manual Organization of the Service Manual 1 2 This service manual has the following chapters Chapter Error Reference source not found Introduction and Specifications Chapter Error Reference source not found describes the Service Manual explains special terminology and conventions and provides complete meter specifications Chapter Error Reference source not found Error Reference source not found Chapter Error Reference source not found treats the Tester s circuitry as functional blocks with a description of each block s role in overall operation A detailed circuit description is then given for each block These descriptions explain operation to the component level and support the troubleshooting and repair procedures in Chapter 5 Chapter Error Reference source not found Error Reference source not found Chapter Error Reference source not found provides information on general maintenance handling precautions and disassembly instructions Instructions covering warranty repairs and shipping the instrument to a service center are also contained in this section Chapter Error Reference source not found Error Reference source not found Chapter Error Reference source not found contains information on required test equipment perf
58. ds Y 8000 BFFF X data space uses 4K words X B000 BFFF and Program space uses the remaining 12K words P 0000 2FFF The first 0 5K word P 0000 1FF of Program space is on the DSP chip U2 EPROM U4 2 35 The EPROM contains the instrument software During start up 512 words 1536 bytes are read from the EPROM and then executed from within the internal DSP program The remaining portion of the 12K words 36K bytes is downloaded into the program space of the SRAM After boot up the EPROM is not accessed again until the unit is powered up again Although U4 is an EPROM it cannot be reprogrammed since it is not a windowed part This type of EPROM is know as an OTP or One Time Programmable EEPROM U11 2 36 The EEPROM 011 provides nonvolatile storage of waveform and calculated data for the Model 41 s memory feature Keypad 2 37 The keypad consists of 15 individual keys in a 4x4 matrix When a key is pressed one of the 16 possible points in the matrix 1s shorted together The rows of the matrix are pulled up to with 30 kQ resistors in Z2 The columns are normally at a low state which is controlled by the DSP The total resistance of the switch as seen at the pca should be less than 3 The contact resistance itself is only about 2000 but there are several other virtual resistors in the circuit including the elastomeric connector that contacts the keypad to the PCA The normal voltage at the four row
59. e 5 1 immediately remove the power from the Tester and isolate the excessive current draw using appropriate troubleshooting methods Table 5 1 Power Supply Current Limits Start up Current Normal w o Backlight Normal with Backlight If the Tester powers up within the current limits of Table 5 1 you can check the power supply voltages against the voltage range specified in Table 5 2 Table 5 2 Power Supplies Supply Name Measure Supply Range mm Te Jct of C63 amp T1 3 13V to 3 47V U15 1 5 75 to 5 25V U17 4 7 to 5V U25 7 18 5 to 15V U14 9 2 1016 to 2 1292V U25 4 23 32 to 20 68V Troubleshooting the Digital Section 5 5 The digital section of the Tester is made up of the digital kernel keypad display and optical interface Fault isolation procedures for each of these areas are listed below 5 5 39 41B Service Manual Troubleshooting the Digital Kernel 5 6 To isolate a problem within the Digital Kernel proceed as follows 1 Check for loose or unsoldered pins U2 through U7 2 Checkall VCC pins on U2 for 3 3V Because the VCC pins on the DSP supply power to different areas of the chip any VCC pin that does not receive 3 3V when is pressed could prevent the DSP from powering up 3 Check that CKSUM OK U2 17 makes a transition from low to high in less than 150 ms when is pressed or when the power supply is up to 3 3V A checksum line that fails to make this transition indicates
60. e test apply the last set of values from Table 4 4 to the Tester 2 Press 3 Using 4 I and 2 Clear store and recall the waveform in memory Testing Harmonics Volts Performance 4 11 1 Press until the harmonics screen is displayed on the Tester 2 M is above the upper right corner of the harmonics display 3 Pressi until A is displayed in the top status line of the Tester 4 Press until 206 is displayed in the top status line of the Tester 5 Connect channel A output of the HP 3245A to the V and COM connectors on the Tester Performance Testing and Calibration 4 Performance Tests 6 Connect channel B output of the HP 3245 to the Current Probe connector on the Tester 7 Setup channel of the HP 3245 to the following values and leave these settings the same for the duration of this test Note The voltage output setting of the HP 32454 is always a peak to peak value V 2 000 Freguency 60 Hz lt shift gt Phase Angle 0 lt shift gt Phase Sync lt enter gt Note The last entry for the HP 3425 settings must be lt shift gt lt Phase Sync gt lt enter gt 8 Set the HP 3425A channel A output volts amplitude frequency and phase angle to the values in Table 4 5 and move the Tester cursor to the corresponding harmonic number Note The last entry for the HP 3425A settings must be lt shift gt lt Phase Sync gt lt enter gt 9 Verify that the harmonic
61. ed by U1 change the feedback path of the amplifiers U9 and U18 thus changing the gain The D inputs to the latch are directly connected to the DSP bus The signal to latch the data is generated by CS GAIN The latch is memory mapped in the Y data space at address FFDO Tables 2 1 and 2 2 show the relationship between the control signals and the selected gain Theory of Operation D Circuit Descriptions Table 2 1 Voltage Gains Gm Table 2 2 Current Gains Range Control Signals Software Anti Alias Filter 2 22 There are two anti aliasing filters one for volts U16 and the other for amps U17 The anti alias filter consists of both sections of U16 U17 and the resistors and capacitors that are connected to them The purpose of the filter is to attenuate any input freguencies that are near or above one half of the sample rate of the a d converters The filter is a 4 pole Butterworth consisting of a cascade of two second order low pass filters The filter has unity gain from DC to 2 015 kHz 0 2 dB The 3 dB point of the filter is at 3 5 kHz The filter should have 19 dB 0 5 dB of attenuation at 6 kHz Level Shifter 2 23 78 translates the input signal from a bipolar signal with full scale range of 2 volts peak to an unipolar signal that goes from 0 to 2 volts The output of the divider should be at one half of VREF when the input is at zero volts The resistors in Z8 are r
62. eption When the instrument is in the HOLD mode sampling and calculations are halted until the hold mode is exited or the display is changed to another screen Circuit Descriptions 2 6 Power Supplies 2 7 There are six power sources required for the Tester s analog digital and LCD circuits A 5V dc and 6V dc source is required for the analog section as well as a 2 1154V dc reference voltage for the a d converters The digital section requires 3 3V dc for the DSP and associated kernel components The LCD module requires 22V dc for power and a variable source of 15 to 19V dc to control the LCD contrast A power on circuit is incorporated to control the application of power to the various sections of the unit Power On Circuit 2 8 VCC The Tester has a soft key power on circuit Closing the power switch turns 011 This turns on 10 which starts the switching regulator U30 To maintain power to the rest of the circuitry the microcontroller U2 sets the signal PWR ON to a high level 2 4V dc and starts toggling W DOG When W DOG goes low it turns on 020 charging C71 to VCC Q9 remains on as long as the voltage on C71 remains above the threshold voltage 2 15V typical With Q9 and Q13 both on Q10 remains on when the power switch is released If something causes U2 not to toggle W DOG 09 turns off after one to three seconds causing 010 to turn off and remove power from the instrument This circuit arrangement allows
63. er Case Bottom sse Removing the PCA and Input Module sse Removing the LCD Module seen Removing the Elastomeric sess Reassembling the Installing the PCA and Input Reassembling the Case Bottom 39 41B Service Manual 3 2 General Maintenance 3 Introduction Warning Service procedures in this chapter should be performed by gualified personnel only To avoid electrical shock do not service this product unless you are gualified to do so Introduction 3 1 This chapter provides handling cleaning disassembly and assembly instructions Warranty Repairs and Shipping Information 3 2 If your Tester is still under warranty see the warranty information at the front of this manual for instructions on returning the unit The list of authorized service facilities is included in Chapter 6 General Maintenance Information 3 3 Reguired Eguipment 3 4 Equipment required for calibrating troubleshooting and repairing the Tester is listed in Chapter 4 Table 4 1 Static Safe Handling 3 5 integrated circuits including surface mounted ICs are susceptible to damage from electrostatic discharge ESD Modern integrated circuit assemblies are more susceptible to damage from ESD than ever before Integrated circuits today can be built with circuit lines less than one micron thick all
64. g R54 Ex o S gt ESS 17 028 199 N _ P FLUKE 40 4001 Sheet 1 of 2 Figure 6 2 Fluke 40 A1 Main PCA 6 10 List of Replaceable Parts 6 FLUKE 40 4001 Sheet 2 of 2 Figure 6 2 Fluke 40 A1 Main PCA cont 39 41B Service Manual Table 6 3 Fluke 41 Final Assembly FLUKE DESCRIPTION STOCK NUMBER MAIN PCA 936864 BATTERY 1 5V 0 480MA ALKALINE SIZE 423582 LED INFRA RED 950 NM 942545 SCREW PH P THD FORM STL 4 14 375 448456 SCREW PH P THD FORM STL 5 14 812 942946 JUMPER INPUT RED 936877 JUMPER INPUT BLK 937040 WINDOW DECAL 936955 CASE TOP 936828 LCD MODULE 160X128 GRAPH TRNSFLECTIVE 928296 MODULE INPUT OVERMOLDED 936836
65. ie ege aE 4 3 4 2 Required 4 3 4 3 Performance Tests A TT 4 3 4 4 Warming Up the 4 4 4 5 Checking the Display 4 4 4 6 Testing Voltage Performance 4 4 4 7 Testing Amps Performance 4 5 4 8 Testing Watts VA VAR Performance 4 7 4 9 Testing Record Mode 4 8 4 10 Testing Memory Mode Performance Model 41 Only 4 8 4 11 Testing Harmonics Volts seese 4 8 4 12 Testing Harmonics Amps 4 9 4 13 Testing Serial I O Performance Model 41 4 10 4 14 Calibrating the Tester 4 11 4 15 m 4 11 4 16 Entering Calibration 4 12 4 17 Making Calibration Adjustments 4 14 4 18 Exiting the Calibration 4 16 39 41B Service Manual 4 2 Performance Testing and Calibration 4 Introduction Warning Service procedures in this chapter should be performed by gualified service personnel only To avoid electrical shock do not perform any servicing unless you are gualified to do so Introduction 4 1 This chapter provides calibration and performance tests that allow you to verify that the Tester is operating withi
66. ion Ons 100 ns 200 ns 300 ns X VY VY VY XIX V 6 20 Min Max 263 15 A0 A15 DS PS X Y Address Bus DS PS XY 15 Min Max CS EEPROM 250 Min Max 15 Min Max 7 100 Min Max 5 05 Min Max p 285 46 Min Max RD 281 96 Min Max N D 3 Finally if there are no solder problems with U11 all address and data lines are properly connected and the timing of the signals to U11 is correct but the data written to U11 is not read back properly U11 may be defective Troubleshooting the LCD Display Module 5 11 To isolate a problem when the LCD display appears dead do the following 1 First verify that the display module is properly connected to the main circuit board Make certain that the flex cable is not twisted or at an angle as it enters the molex connector of either the LCD module or the main circuit board 2 Verify that the CS LCD and the LCD E signals from U3 are correct If the timing is correct the problem may bewith the contrast If there are no connection problems the timing waveforms are correct and the contrast adjustment is not the problem see Starting with a Dead Tester on page 1 3 there may be a problem with the LCD module 39 41B Service Manual 0 15 DS PS X Y d Address Bus DS PS XY ns 100 ns e ns
67. is low U3 may be defective 39 41B Service Manual Figure Introduction Chapter 6 List of Replaceable Parts How to Obtain 8 Manual Status Information Newer Instruments esses eene Service Centers cccecessssoscccccccocsessssscccccscossessssececevseesessscsscesessossesseces 6 1 39 41B Service Manual 6 2 List of Replaceable Partsintroduction 6 Introduction 6 1 Chapter 6 contains an illustrated list of replaceable parts for the Fluke 40 and 41 Power Harmonics Meter and Analyzer Parts are listed by assembly alphabetized by reference designator Each assembly 1s accompanied by an illustration showing the location of each part and its reference designator The parts lists give the following information Reference designator An indication if the part is subject to damage by static discharge Description Fluke stock number Total quantity Any special notes 1 e factory selected part Caution A symbol indicates a device that may be damaged by static discharge How to Obtain Parts 6 2 Electrical parts may be ordered directly from the manufacturer by using the manufacturer s part number or from the Fluke Corporation and it authorized representatives by using the part number under the heading FLUKE STOCK NO In the U S order directly from the Fluke Parts Dept by calling 1 800 526 4731 Parts price information is available from the Fluke Corporatio
68. ister amps data is clocked out and read This process repeats until the until the appropriate number of samples have been read Serial Multiplexer 2 32 There are three sources of serial data the volts a d converter the shift register holding the amps data input and the serial EEPROM U22 The DSP signals the PLD multiplexer to select one of the three sources and feed that source DOUT to the single serial port on the DSP EEPOT Contrast Control Interface 2 33 The interface of the PLD provides the chip select 5 EEPOT and the control INC EEPOT signals for the EEPOT The signal that controls the direction of the wiper comes directly from the DSP Reading or writing to address location Y FFE0 enables CS strobes the INC POT signal After the correct value is reached location Y SFFFO is read or written to clear the CS EEPOT which writes the value into the EEPOT SRAMs U5 U6 U7 2 34 The SRAM is used for two main functions operating code storage and sampled and calculated data storage After the Fluke 40 41 has completed its initialization and is run Theory of Operation D Circuit Descriptions ning program execution is directly from one program section of the SRAM Storage of all sampled and calculated data is stored in the X and Y data spaces The 96 kilobytes 32 kilowords x 24 bits of static RAM is divided into three sections Program X data and Y data The Y data space uses 16K wor
69. lines is Vcc when no keys are pressed When a key is pressed the corresponding row is pulled down to about 0 4V dc The four row signals are also connected to U3 If U3 senses that any of the row signals is in a low state it generates an interrupt to the DSP By applying a logic low to the columns one by one the DSP can determine the pressed key Display 2 38 The Fluke 40 41 display consists of two circuits the LCD Module and the Contrast Control LCD Module 2 39 The LCD module is a complete system It contains the liquid crystal LCD drivers con troller display RAM backlight and hardware to hold it together as a module The LCD module connects to the rest of the system with a 24 conductor flat cable This module controller was originally intended to be directly by either a Motorola or Intel based 8 bit controller Extra logic was required to interface the display control lines to a fast DSP This logic resides in the PLD U3 Specifications e x 128 pixels WxH e FSTN Film Compensated Super Twisted Nematic e LED backlight e 32Kx8 display RAM e Integrated 1335 controller 2 13 39 41B Service Manual Backlight 2 40 The backlight is a series of 24 yellow green Light Emitting Diodes LEDs The diodes are connected two in series and 12 in parallel The backlight control circuit switches the current and sets the level of the current to the diodes 015 R51 R55 R57 and R60 form a level shifter to turn on control tran
70. n or its representatives Prices are also available in a Fluke Replacement Parts Catalog which is available on request In the event that the part ordered has been replaced by a new or improved part the replacement will be accompanied by an explanatory note and installation instructions if necessary To ensure prompt delivery of the correct part include the following information when you place an order Instrument model and serial number Quantity Reference designator Part number and revision level of the pca containing the part Description as given under the DESCRIPTION heading Manual Status Information 6 3 The Manual Status Information that precedes the parts list defines the assembly revision levels that are documented in the manual Revision levels are printed on the bottom side of each pca Newer Instruments 6 4 Changes and improvements made to the instrument are identified be incrementing the revision letter marked on the affected pca These changes are documented on a supplemental change errata sheet which when applicable is included with the manual 6 3 39 41B Service Manual Service Centers 6 5 A list of service centers is located at the end of this chapter Manual Status Information Ref Or Option Assembly Name Fluke Part Revision Number Number Level Fluke 40 Main PCA 948786 A1 Fluke 41 Main PCA 948794 Table 6 1 Fluke 40 Final Assembly REFERENCE DESIGNATOR DESCRIPTION MAIN PCA
71. n published specifications Reguired Eguipment 4 2 The eguipment in Table 4 1 is reguired for performance testing and calibration If the recommended models are not available eguipment with eguivalent specifications should be used Table 4 1 Recommended Test Eguipment Eguipment Type Minimum Specifications Recommended Model Calibrator A volts DC Voltage Fluke 5700A Range 1 mV 600V Fluke 5500A Accuracy 0 12 AC Voltage Range 1 mV 600V Freguency 60 Hz Accuracy 0 12 Calibrator B volts AC Voltage Fluke 5200A Range 30 mV 1 4V Fluke 5500A Freguency 60 Hz Accuracy 0 12 Phase meter Phase accuracy 0 5 degrees amp 60 Hz Clarke Hess Model 6000A comparing 10 mV and 5 V inputs Fluke 5500A Dual channel AC Voltage HP 3245A signal generator Range 50 mV 20 V Fluke 5500A Frequency 60 Hz Accuracy 0 596 Phase accuracy 0 5 degrees amp 60 Hz sourcing 10 mV and 5 V inputs A second calibrator phase meter and dual channel signal generator is not required when using one Fluke 5500A Multi Product Calibrator Performance Tests 4 3 If the Tester passes the following tests the meter is in proper operating condition If the meter fails any of the performance tests calibration adjustment and or repair is needed 39 41B Service Manual Warming Up the Tester 4 4 Before performing any of the following performance tests the Tester should be allowed to sit for four hours in an environment of 18 289
72. nverters user input via the keypad and user input through the serial optical interface The display 1s the primary output device but the digital kernel also controls the input conditioning and sends data to a PC or printer through the optical interface The DSP takes the a d converter samples and stores them in static RAM SRAM When enough data samples have been taken the DSP calculates the values and waveforms for display No matter what screen is presently on the display the calculations for all display readings are always performed The display routines determine which screen the user has selected and displays the appropriate data for the screen requested All values and waveforms are the result of thousands of calculations performed by the DSP The optical interface communicates with a PC or printer and it provides a sufficient voltage standoff for safety reasons The Fluke PM9080 interface cable is required to com plete the interface to a PC or printer Circuit Operation 2 3 To help you understand the circuit operation the power up and normal operation sequences are explained below Power Up Sequence 2 4 1 The power button is pressed 2 The power supply settles to 3 3 volts about 11 ms after the On button is pressed The reset line U2 123 changes from high to low about 30 ms after the On button is pressed 4 The DSP automatically downloads 512 words 1 536 bytes of instrument operating code to instrument RAM from the
73. ormance test procedures and calibration of the instrument Chapter Error Reference source not found Error Reference source not found Chapter Error Reference source not found provides detailed repair procedures to the component level Troubleshooting and repair procedures rely on the Theory of Operation presented in Chapter 2 and the Schematic Diagrams in Chapter 7 Chapter Error Reference source not found Error Reference source not found 39 41B Service Manual Chapter Error Reference source not found lists the parts used in the Tester as well as information on how and where to order parts Chapter Error Reference source not found Error Reference source not found Chapter Error Reference source not found contains the schematic diagrams for all assemblies and a list of mnemonic definitions to aid in identifying signal name abbreviations Conventions 1 3 The following conventions are used in this manual e Printed Circuit Assembly A is a printed circuit board and its attached parts e Circuit Nodes A pin or connection on a component is specified by a dash and number following the component reference designator For example pin 19 of U30 would be U30 19 e User Notation Switch positions used in the meter circuit descriptions correspond to those in the schematic diagrams in Chapter Error Reference source not found General Information 1 4 Description 1 5 The Fluke 40 and 41
74. owing more than a million transistors on a 1 4 inch square chip These submicron structures are sensitive to static voltages under 100V This much voltage can be generated on a dry day by simply moving your arm A person can develop a charge of 2 000V by walking across a vinyl tile floor and polyester clothing can easily generate 5 000 to 15 000V during movement against the wearer These low voltage static problems are often undetected because a static charge must be in the 30 000 to 40 000V range before a person will feel a shock Most electronic components manufactured today can be degraded or destroyed by ESD While protection networks are used in CMOS devices they can only reduce not eliminate component susceptibility to ESD ESD may not cause an immediate failure in a component a delayed failure or wound ing effect is caused when the semiconductor s insulation layers or junctions are punctured The static problem is therefore complicated in that failure may occur anywhere from two hours to six months after the initial damage Two failure modes are associated with ESD First a person who has acquired a static charge can touch a component or assembly and cause a transient discharge to pass through the device The resulting current ruptures the junctions of a semiconductor The second failure mode does not require contact with another object Simply exposing a device to the electric field surrounding a charged object can destroy or degrade
75. rtation costs of repair replacement parts when product purchased in one country is submitted for repair in another country Fluke s warranty obligation is limited at Fluke s option to refund of the purchase price free of charge repair or replacement of a defective product which is returned to a Fluke authorized service center within the warranty period To obtain warranty service contact your nearest Fluke authorized service center or send the product with a description of the difficulty postage and insurance prepaid FOB Destination to the nearest Fluke authorized service center Fluke assumes no risk for damage in transit Following warranty repair the product will be returned to Buyer transportation prepaid FOB Destination If Fluke determines that the failure was caused by misuse alteration accident or abnormal condition of op eration or handling Fluke will provide an estimate of repair costs and obtain authorization before commencing the work Following repair the product will be returned to the Buyer transportation prepaid and the Buyer will be billed for the repair and return transportation charges FOB Shipping Point THIS WARRANTY IS BUYER S SOLE AND EXCLUSIVE REMEDY AND IS IN LIEU OF ALL OTHER WARRANTIES EXPRESS OR IMPLIED INCLUDING BUT NOT LIMITED TO ANY IMPLIED WARRANTY OF MERCHANTABILITY OR FITNESS FOR A PARTICULAR PUR POSE FLUKE SHALL NOT BE LIABLE FOR ANY SPECIAL INDIRECT INCIDENTAL OR CONSEQUENTIAL DAMAGES OR L
76. should be on the appropriate latch input pins to be latched into the latch If the CS GAIN pulse is not generated verify that all of the correct signals are correctly feeding U3 A15 A14 A5 A4 RD WR XY PS If they are correctly feeding and you still do not have a correct CS_GAIN signal U3 may be defective Alternatively if the CS GAIN signal is present to the UI latch but the correct data is not getting latched verify that the data bus feeding the latch contains the correct data on the rising edge of the CS_GAIN pulse If the data bus does contain the correct data on the rising edge of CS_GAIN but the data is not getting latched there is probably a defective latch U1 Troubleshooting the EEPROM 5 10 The EEPROM U11 is used for waveform storage and is only installed on the Model 41 To isolate waveform storage problems proceed with the following 1 Verify that R82 and R84 are correct and installed Also verify that R83 and R85 are absent Verify that CS EEPROM is changing states correctly when trying to read write a waveform to EEPROM The write timing to EEPROM should have similar timing with the RD signal replaced with the WR signal If the CS EEPROM pulse is not generated verify that all of the correct signals are present on U3 A15 A14 AS A4 RD WR XY PS If all signals are present and you still do not have a correct CS EEPROM signal U3 may be defective Troubleshooting Troubleshooting the Digital Sect
77. sistor 016 When Ol6 turns on it establishes reference voltage of 100 mV at the noninverting input of U21 U21 through Q14 forces 100 mV across the parallel combination of R54 and R59 This action causes the current through the back light to be 40 mA Contrast Control 08 2 41 The Contrast Control EEPOT is functionally the same as a regular potentiometer except that the wiper location 1s controlled via a digital interface instead of a knob The digital interface to this part consists of three lines chip select CS increment wiper INC and up down U D To adjust the potentiometer CS is brought low and the INC line is strobed The direction of the wiper is dependent on the state of the U D pin U8 is configured as a simple voltage divider and controls the voltage supplied to the LCD module This voltage varies from 15V dc to 18 5V dc Optical Interface Model 41 Only 2 42 This interface consists of two main sections the receiver and the transmitter Data going out of the unit 1s transmitted through a infrared LED Incoming data is captured through a photo transistor in the receiver Transmitter 2 43 CR6 is an infrared emitter used to communicate with an optical RS 232 interface cable provided with the Fluke 41 The transmitter circuit is a simple level shifter used to provide more current to the LED than the DSP can provide directly Q21 is used as a current switch to turn CR6 on and off When TXD on the mi
78. st entry for the HP 3425A settings must be lt shift gt lt Phase Sync gt lt enter gt 8 Verify that the harmonic amplitude and phase angle readings displayed by the Tester are within the minimum and maximum limits listed in Table 4 6 Table 4 6 Harmonics Performance for AMPS Harmonics screen Channel B Output Tester Cursor Accuracy Accuracy mo no mn min sro 5700 Testing Serial I O Performance Model 41 Only 4 13 Confirming serial I O performance reguires the RS 232 optical interface cable FlukeView software and a PC running Window 3 1 If not already done install the FlukeView software on the PC and configure for the appropriate serial port Performance Testing and Calibration 4 Calibrating the Tester 1 Connect the optical interface cable between the optical interface on the side of the Tester and the serial port of the PC Note The correct serial port on the PC will be determined by the configuration of the PC and installation of the FlukeView software Open FlukeView M software on the PC Turn on the Tester From the FlukeView toolbar choose the camera icon ee Communication over the serial I O port is confirmed when the picture window on the PC displays a picture of the Tester s display with the appropriate values and or waveform 6 To confirm the print function press the Print button and confirm the Tester displays
79. ster 12 Apply 350V rms at 60 Hz After allowing the reading to settle press on the Tester 13 Apply 600V rms at 60 Hz After allowing the reading to settle press on the Tester 14 Press 05 to start gain factor calibration g 4 15 39 41B Service Manual 15 Apply 175V rms at 60 Hz After allowing the reading to settle press on the Tester 16 Apply 350V rms at 60 Hz After allowing the reading to settle press on the Tester 17 Apply 600V rms at 60 Hz After allowing the reading to settle press on the Tester 18 Press to accept calibration factors and store in nonvolatile calibration memory The Tester will then return to normal operation After calibrating the Tester remove the battery access lid and batteries and return the battery shunt spring to its normal position Place a new calibration seal P N 937045 over the calibration access port to prevent unintentional entry into the calibration mode When the calibration seal is in place install fresh batteries and reinstall the battery access lid Exiting the Calibration Mode 4 18 Press 0 to exit the Calibration mode If this button is pressed prior to completion of all calibration points no changes are made to nonvolatile calibration memory 5 5 0 00 o deep c Ur CA CA Un CA NAS Chapter 5 Troubleshooting nttOQUCtOD ete eR ak KE aN SEI STS General Troubleshooting
80. t is collecting data in normal operation mode the above four waveforms can be observed with the following timing 5 7 39 41B Service Manual 241 824 Hz JUV UU UUW ITU UUW UU UU UUUU UU UU UU UU UU U 4 426 62 ns es 4 135 ns sro XX 0000060000000000000000 10 072 Hz VOLTS AMPS When SCO is low SRD is the output of the volts a d converter and amps when high Note When the instrument is in normal operation it will collect data for about 234 6 ms when the input frequency is gt 10Hz then process data for 80 ms with the process repeating With an input frequency lt 10Hz it will collect data for 469 2 ms then process data for 80 ms with the process repeating If SCO SC2 and SCK are not present and the Tester is collecting data in normal operation not in HOLD or memory mode powering on properly responding to key presses properly and displaying the correct screen the DSP U2 may be defective If SRD is not correct either the A D converters may not be generating DOUT or U3 may not be producing the SRD signal correctly 2 Check for proper communication between U3 and the A Ds U14 and U15 U3 has four control lines to the a d converters 241 824 Hz see DOUT VOLTS
81. t step in the case of an instruction or store the displayed calibration factor for that specific test By pressing the arrow key more than once you can bypass a step in the calibration menu When this happens you must restart the Calibration routine Note Make sure each calibration step is complete before pressing enter Press enter only once for each calibration step or instruction There will be a slight delay before the arrow moves to the next prompt or instruction on the display after pressing enter Upon completion of all calibration steps you are instructed to accept the Tester s new calibration factors by pressing 292 or cancel the calibration by turning the Tester off other button operations are ignored Performance Testing and Calibration 4 Calibrating the Tester To capture usable calibration factors the calibration source output must be stable and the Tester factor readings must settle to their final value Once the factor reading has stabilized press to move to the next calibration step or instruction If all of the calibration steps are completed and ACCEPT CALIBRATION is performed by pressing the new calibration factors are stored in nonvolatile calibration memory At this point calibration is complete and the Tester exits the calibration mode While in the calibration mode the Tester prompts you through the following steps Warning During calibration dangerous voltages are preSent in the instrument
82. tection Levels IEC 1010 1 Pollution Degree 2 Installation Category III Material Group II 600V Protection Class Protection Class II as described in IEC 1010 1 Annex H Double or Reinforced Insulation Waveform Memory Model 41 only Eight nonvolatile memories store a maximum of 2048 1024 x 2 sampled points of waveform data for both voltage and current inputs for later recall or sending to a computer EIA 232 E RS 232 Interface Model 41 only Optically Isolated 1 2 9 6 or 19 2 kBd rate Display Picture Printer output in either Epson FX 80 or HP Thinkjet format Waveform Data Picture formats may be remotely accessed Remote Trigger function 1 8 Introduction Functional Block Description Circuit Operation Power Up Sequence Normal Operation 2 p ober eerie Sn TOTTA Circuit Descriptions Power Supplies Power On CU ti hiai ie Low Battery Detection Power Reset Input Conditioning iial debe maan naan Difference Amplifier Voltage Input Protection Circuit Current Channel Gain Amplifi Latch 01 Anti Alias Fi Level Shifter A D Converters Digital Kernel Digital Signa Chapter 2 Theory of Operation Title Page a l2 EET 2 6 2 6 2 6 2 6 2 6 2 8 Q 2 8 2 8 Q 2 8 Q 2 8 O 2 8 Q
83. the instrument to always recover from any microcontroller crash Q8 signals the microcontroller that the power switch has been pressed after power has been applied The microcontroller considers this a signal to turn off the instrument 2 9 U30 is a buck switching regulator that changes the battery voltage 4V to 6V dc to the 3 3V dc needed for the digital circuitry The battery is always connected to the power pin of U30 U30 is in the standby mode until pin 1 goes to the battery voltage level R31 and C50 set the soft start time Feedback from the voltage divider R48 and R41 sets the output to 3 3V dc 5 The feedback voltage is 1 224V dc Transformer T1 and Theory of Operation D Circuit Descriptions capacitor C63 filter the output of U30 U30 has an internal Undervoltage Lockout circuit The circuit monitors the supply voltage and allows normal operation for voltages greater than 3 75V dc typical with 0 25V dc of hysteresis When an undervoltage is detected control logic turns off the internal power FET and momentarily grounds C50 This starts a soft start cycle Circuit operation will not start until the supply voltage VBT goes above 3 95V dc 22 VOLTS 2 10 The raw voltage needed to run the LCD bias is provided by the TLC555 timer 019 and transformer T2 These two components work as a boost circuit to change the battery voltage to 24V dc 04 in addition to working in the boost circuit inverts the 24V dc through CR8 C5
84. the interrupt has occurred the appropriate row line is driven low when the appropriate column line is also driven low This occurs during the interrupt process when the microprocessor is decoding the keypad See the keypad schematic in Chapter 7 If the row line is driven low for an incorrect column line then there is some external problem possibly a keypad or elastomeric interconnect problem Troubleshooting the Range Control Circuit 5 9 The Tester s measurement range can be changed manually or automatically If the Tester is unable to change ranges proceed with the following steps 1 Check for the correct level at U1 12 through U1 18 by placing the instrument in manual range and verifying that the input latch is set to the values in Table 5 3 5 9 39 41B Service Manual mee vaa ess ur aa s ma wa va sv 3 pw wa ma ww 3 o pw ma ma mmm wa wa 1 wa 9 son maroon wa wa wa 1 Logic High gt 0 2V and 0 Logic Low lt 0 8 Table 5 3 Latch Signals for Voltage Ranges If the latches are correctly written there is a problem somewhere in the analog input circuits Refer to the analog theory for troubleshooting assistance If latch U1 is not written properly verify that CS_GAIN from U3 18 occurs when a range change is attempted Also the data
85. the program was not loaded properly from the EPROM into SRAM This could indicate a problem with an address line data line control line RD WR DS PS x y or EE UPLOW line that is not high at reset or it could indicate that U2 through U7 is faulty or has a bad solder joint 4 Checkthat W DOG U2 35 or the side of C57 not tied to R77 changes state at least once every second For certain areas of code such as in the user interface it may change state at a significantly higher rate The minimum width of W DOG pulse is 15usec If the W DOG signal does not appear and the DSP is running with the CKSUM OK line high then U2 may be bad 5 Check the DSP CLOCK signal U2 123 or U3 43 with a high speed oscilloscope A clock frequency of 38 6918 MHz should be observed If this clock signal is not present verify that the oscillator circuit tied to U2 1 and U2 132 is correct The crystal frequency is 3 86918 MHz The DSP chip multiplies the crystal frequency by 10 to produce the DSP clock frequency 6 The reset line U2 125 should go high approximately 20 ms after the DSP chip sees 3 3V on its Vcc pins If this does not occur check the power supply and the reset circuit 7 Check that MODE C U2 119 is low when reset U2 125 goes from low to high If it is not low check that diode CR2 is correct and installed properly 8 Check that MODE B U2 120 is low when reset U2 125 goes from low to high If it is not low check that diode
86. ule away from the case top The input module remains attached to the pca 3 Lift the pca and input module out of the case top The flex cable pulls away from the connector when the pca is lifted out of the case 3 5 39 41B Service Manual Removing the LCD Module 3 10 After you have removed the case bottom and pca use the following procedure to remove the LCD module 1 Remove the four Phillips screws from the corners of the LCD module 2 Lift the LCD module out of the case top Removing the Elastomeric Keypad 3 11 After you have removed the case bottom and pca lift the Elastomeric keypad out of the case top Reassembling the Tester 3 12 Generally reassembling the Tester is the reverse of disassembly However you must follow special precautions when installing the pca and input module Installing the PCA and Input Module 3 13 1 With the pca held outside the case top and the flex cable connector latch pulled out insert the free end of the flex cable into the connector Make sure that the flex cable Figure 3 2 Flex Cable Connector 3 6 General Maintenance 3 Reassembling the Tester is fully engaged Push the connector latch back against the connector body Rotate the pca into the case top aligning the holes in the pca over the six bosses Make sure that the pca is pressed down over the ribs of the boss in the upper right corner of the case top Align the top edge of the input module with the sealing groo
87. ve on the case top While ensuring the input module remains squarely within the side walls of the case top press the input module into the groove until it seats snugly against the top edge of the case top Ensure the four leads from the input module remain connected to the black wire must be dressed so that it wraps counterclockwise into the connector Both the black and red wire must be dressed so they bend outward toward the side of the case and are not between the pca and the plastic cylinders of the input module Reassembling the Case Bottom 3 14 1 Align the bottom edge of the input module with the sealing groove on the case bottom While ensuring the input module remains sguarely within the side walls of the case bottom press the case bottom onto the input module until it seats snugly against the top edge of the case bottom If the case bottom gets cocked at an angle to the sides of the input module the case top and case bottom will not come together properly Make sure the case bottom and case top are firmly pressed together The gap width on either side of the instrument between the case bottom and case top should be approximately egual Reinstall the six Phillips screws into the case bottom Reinstall the batteries and fasten the battery cover in place using the two slotted screws 3 7 39 41B Service Manual 3 8 Chapter 4 Performance Testing and Calibration Title Page 4 1 Introduction
88. ways Two of these ports are for serial communications The Fluke 41 makes use of one serial port for RS 232 communication to printers or PCs over a special optical interface and cable The second serial port is used by both models to communicate to the two a d converters U14 and U15 and the serial EEPROM U22 The other I O ports are used for various control and sensing keypad interface power control low battery sense and memory bank switching This DSP unlike most common microcontrollers is optimized for calculations instead of control The data bus is 24 bits wide All internal data registers are 24 bits except two accumulators which are 56 bits wide There are three 64K address spaces that share the same external address and data bus The three address spaces are Program X data and Y data Code can only be executed from the program space but data can be stored and retrieved from all three address spaces The control lines DS PS and X Y from the DSP control which of these three address spaces are accessed Although this may sound a bit complex with the three address spaces you could think of the PS and X Y signals as two more address lines A16 and A17 Programmable Logic Device 2 27 A Programmable Logic Device PLD replaces several generic parts that usually consume more board space and power Much like a ROM these parts can be programmed into an almost limitless combination of circuits This makes them easy to use but
89. with the keypad do the following 1 Check the column C0 C3 and row RO R3 lines that go to the keypad module With no keys pressed and the instrument powered up the PWR SWI P3 10 should be at the battery voltage 5 to 6 volts PWR SW2 should be at digital ground Column lines CO to C3 should be driven low Row lines RO to R3 should be pulled high to VCC 3 3V Thus a key press should cause the appropriate row line to be driven low momentarily Refer to the keyboard schematic in Chapter 7 to identify which row line will be driven low for a given key If the column lines from the DSP chip U2 are not low while the instrument is running and updating the display the column line may be shorted to VCC or there may be a problem with the DSP chip If a key press does not drive a row line low there is probably a problem with the keypad or the elastomeric interconnect 2 Check the IRQA line while pressing a key The IRQA line 02 121 or U3 9 should be asserted low when a key is pressed to cause a user interface interrupt in the DSP chip U2 If the IRQA line is asserted and the correct row line to the DSP chip is also asserted but the key still is not recognized there may be a problem with the DSP chip The IROA line should be asserted by U3 if the RESET line U3 2 is low and one of the row line inputs to U3 is driven low by a key press If the IRQA line is not driven low under these conditions U3 may be defective 3 Verify that after

Service Manual

Contents

Download Pdf Manuals

Related Search

Related Contents