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1. Left column Circular polarization film RELY A microlk HLY Zz FUJINON HF16HA 1B a FUJINON HF16HA 1B FUJINON HF 12HA 1B x4 X10 X20 X40 Standard Objective Lens Computar MLM 3XMP NNN RET they DIF 4A 2015 0415 BSA Photonic Lattice Inc T 989 3204 ey Sk VIL A h ee SE Ps 6T H 6 3 ICR 2F TEL 022 342 8781 FAX 022 342 8782 ICR 6 6 3 Minami Yoshinari Aoba ku Sendai city Miyagi 989 3204 JAPAN Phone 81 22 342 8781 Fax 81 22 342 8782 e mail sales photonic lattice com URL http www photonic lattice com2. retardation of a few thousand nm Suitable for measurement of the retardation distribution of optical films and molded transparent objects AA HEDRA Transparent plastic molded objects k Light guide plate TIIVA Optical film LYZ Lens itHH 74 LA Phase difference film EE D7 ADR WPA 200R 7 3 WPA 200Rf 7 2 WPA 200IKk OH TES Bl Standard camera image Retardation distribution data Retardation distribution data Evaluation of the retardation uniformity WPA 100 S AV hI AV AE EO ELV ZOR MEH RI Suitable for the evaluation of small lenses as for smartphones KERELS TITRE CSVT FHA FHERR ARASH Large Graph Functions J csv format export fast slow_ axis Automatic OK NG measurement range selectable decision MEL YA LOmm PE BEL POSE YTRER ELIE AERO BBE RHE MAET 7eZICL EC BB AE RETA E Upgraded system is suitable for the evaluation of small lenses less than 010 mm Auto selection function of a circle area and OK NG decision function equipped BHABREAZL YZ Molded plastic lens AY hI4ALYALYAZ Lenses for smart phone OLY AIA yYh AL YA Lens unit Assembled lens 1m OAAD HR WPA 100 S R4 T F A EHIE HERE WPA 100 SEN 5 4 Standard camera image Retardation distribution data OK NG decision function Retardation distribution data E O WPA micro AM EF OREHA EHI For high retardation measurement in microscopic view area KEGHELY JFIRE CSVF FHA EHEER Rat
3. Aa LAT BE EONS BE PR aE M Usable on any microscope with C mount port Output value is not ae ee e gt Ska Spherocrystal ne EE O im SEGA MGR Standard polarization microscope image gnarl IE 0 BIE 90 AF 90 BHF 0 Pl microla7 S oe Polarizer 0 Polarizer 90 Analyzer 0 Retardation distribution data Analyzer 90 I t HaAciZean Plastic molding MHZ HAMAR OBWAMRIC RR 6D JPACASHOBEILAMCT Et HBO o Elz KEELE SIR AI RECT Changes of the molding conditions are reflected in the retardation distribution so retardation data become a good indication for process control 1 OAATER MH AT F A mODATH ER MHS AT F Standard camera image Retardation distribution data Standard camera image Retardation distribution data 4 measured with WPA 200 measured with WPA 200 L Wis IADAME Glass MILA DAODMADAP L F MLIKKSHIAZNDEARKERREECSE SH MGT OCEMCEET It becomes more and more important to measure the internal stress of strengthened glass or after laser processing S EE 1a X POLAILESHIAROBAD HOE Bea see Comparison of glass distortion between different processes alfa noes Cause yy eer ptosis ity measured with PA 200 L ILYZz Lens T KBADA MEI RSE HHRADMERLESF EST Ikt RBACRIBARHLA ERR RORHISRBHLET RRLUVERBIT SOE PSGLIMBAENRAIDBATCT Establishing low retardation process is necessary because Small unevenness of retardation is detectable easily large retardation reduce the resol
4. FA D ill jE BE RE WPAYY X Measurement capability of large Retardation WPA 8 ORE CHET FEAHRCLRBRIT SCLC M1000nmMeEXSSMHAEO MD HAE tA REICLELE By the calculation of 3 data sets with different wavelengths WPA system can measure large retardation of a few thousand nm R4E523nm TEJ 700 nm A M BGORE CHELLT FZ BSRENELASS UE BE HR 4248 94500nmO 7k date D All FE Bil Data with 3 wavelength Mixed data of large retardation Example data of a quartz plate with large retardation fast A LeUY Oia CREE Structure and Measurement principle of the polarization imaging sensor ASEH OMBIC MAORMRAIOLIARESH CHET BEMBROESMELU BANS SLE ILLSERLT Our original integrated polarization filter is set in front of a CCD oA Slaee BHI SREICMG IT SCLEMCEET By calculation of signals of 4 neighboring CCD cells the data which was CCD l obtained with rotating filter traditionally is available instantly BRS HAARR Linear polarization Circular polarization ICA RE Polarization state Bit xt 78 H EmA Intensity pattern Polarization Imaging sensor Integrated polarization filter WPA 200 L Hom H10cmONVY FILOLH BHEIX For allover measurement of large size and large retardation samples RZA LLYA AP vav Zoom lens Option Large Graph Functions f csv format export fast slow_ axis measurement range selectable 1000 nme KSLA AIT AH HUE PREN FEE FTIA ARENO A at A A th DAB EAS ATE CRP Standard system can measure high
5. I Imaging Resolution Approx 0 11 M pixels HERE Measurement Wavelength iB SE 30 A Retardation Range fe IRL BBE Measurement Repeatability gt I z S REREH 24 X 32 mm 100 X 133mm 33 X 44mm 240 X 320mm 4 0 X 5 4mm 11 6 X 15 8mm 80 X 110um 2 X 2 6mm Measurement Area Size AMAT Size 270 X 340 X 560mm 430 X 490 X 910mm 200 X 275 X 310mm 250 X 487 X 690mm AREE Weight 13kg 23kg 9kg 11kg JIN IEF Software WPA View or 100 5 N MAZ BU AMA APC YVIRI IrF WIRE Contents of product Main system PC Software Manual BELY A microlkMWMLY R Standard Objective Lens 523 543 575nm 0 gt 3000nm o lt inm FUJINON HF 16HA 1B FUJINON HF 12HA 1B Computar MLM 3XMP x2 X5 X10 X20 X50 PA 110 S PA micro Pl micro toa Bm Iry Sensor Standard Polarization Imaging Sensor EEJ 497p ER Imaging Resolution Approx 0 97 M pixels BUTE RR 520nm Measurement Wavelength ial FE So A aoa Rak Wt Retardation Range out of warranty RU IRL BRT Rak Wt cee o lt inm Measurement Repeatability out of warranty lt a 238 BE z LJA aa EIZ Measurement Area Size 5 2 X 4 8 16 8 X 13 0 mm Depend on the microscope attached AMA TIE Size 270 X 340 X 560mm 430 X 490 X 910mm 160 X 220 X 313mm 240 X 400 X 530mm 33x45 7x58 6mm AMA Weight 12kg 22kg 10kg 100g pe YIKILTY Software PA View PA View for micro PA View Pl View Bean AZ mA PC YORU RRA ac FA tg 3 7 4 LS Contents of product Main system PC Software Manual
6. Mua IIBRTIARMEAlHaee WPA PAY UJ ZA Retardation Birefringence and Internal stress measurement WPA PA Series RAtestSttIthiyIsSTAR EN a BHAONMAZ RTT ABBAD LRI 2 Ze FB A BR CUE e ART High speed measurement of the 2 D distribution in transparent objects and films quantifying their Retardation Birefringence and Internal stress q fifi pE RRM Easy operation high speed measurement HYTIERIRRFT VIEOT MERILELVIA TI IIF SEM O RRE RA OITA SEYH NRE HE OS AEA F RIL RCS Unique polarization imaging sensor realizes easy and high speed operation to measure the distribution of the retardation ERAR 24K O thi EF LL CO BE Conventional method Cross Nicol observation P y lt D4 ILA DAE CHAADBMEL RD ER HUT ILERAF VIIB lt BERAVADY YD 107 F E CH EER _ Estimation is difficult because the image changes as the filter rotates aa S u FS Mar g6 ai Setting of a sample Click of measurement button Output data in about 10 seconds 7 PAKi Ja LPI PENT MERE Various analyzing functions of 2D data MHEORBEGH AAT FZ MHEOKESSEME ORE BMHILRAR HRM TIPILCEET The powerful analyzing function of the 2D data supports an instinctive understanding of the character of the measuring samples BIET 2O Fl fBREOMHETII Em TRIROEALTIL An example of measured data Graph of the retardation along arbitrary line Histogram within arbitrary area a RE7RAL
7. dation PAAA data z A PA 110 S EBAOELU AOR EHEM For the evaluation of small lenses of low retardation oasi LALUVYZ csv format export J Retardation axis ZAN ER display 21 0nm fE E L FORMA EELA AO FM ICA Upgraded system is suitable for the evaluation of low retardationl lenses less EBAL YA Low retardation lens AY hIAYA NAIL Glass panel for a o AH ON ATH PA 110 SR4 T 4 AOVP PA 110 S44 7 Standard camera image Retardation distribution data Standard camera image Retardation distribution a PA micro RMA EVUT LOR Mea elo For low retardation measurement in microscopic view area AM A RAC Microscope Olympus CX41 zsz7me csve sinn moe Graph Functions f csv format export J f Retardation axis display ES EOR ENDE REDIT PI EDI Entry model for micr oscopic retar ee measurement L MLI kOHIAZEAO Mihi SASH Otimi Evaluation of the stress generated by laser processing Evaluation of the crystal orientation of a mica plate BR OAAT EE PA microlyf 7 HRODATH ER PA microR T 3 Standard camera image Retardation distribution data Standard camera image Retardation distribution data Pl micro faI CTA i CH SNORE O BUEIE AME RTALTEAEEA Quantifying camera of the polarization microscopic data Microscope is not included J57 CSVF 4HA HARR RAF Graph Functions csv format export f f Retardation axis Reflection display evaluation CVI ER hE CERO BED
8. ti Large Graph Functions f csv format export fast slow_axis Reflection measurement range selectable GA ise I gt S1LV100 Microscope Nikon LV100 evaluation IEDF IPT 4 AO Ae Ski EEO HEIZ ri IC DA EL CARLES AS Ts FR 2 AE RICE EAE BOA Eh AT He Suitable for the measurement of spherocrystal metal crystal and the cross section of strengthened glass Polarization microscopy quantitative data is easily obtained Capable of reflection evaluation Batti Ge Macromolecular crystal KEJI IJL Optical film k Spherocrystal OHA Composite phase difference film i OAADER WPA microltt 7 F i OWADTHE WPA microhY 7 F Standard camera image Retardation distribution data Standard camera image Retardation distribution data F i A rJ i None 3 PA 200 L HIAGZEDEUMAZYY TIOE EAEI For overall measurement of low retardation samples as glasses JITRA CSV7F 3HJ 4 77 feo LYR etardation axis Graph Functions f Besv format export display Zoom lens Option AEMET NI ARRECA ECTARAS WI ADBAR MIC Standard system for the measurement of low retardation objects Suitable for the evaluation of strain in glass HAA ia Glass parts 5A 3 I Transparent wafer ADANOWAEMAI Impressed pressure to AV hIAY ANAL Glass panel for a P SiC E ARBA Inner defect of SiC i OAATHE PA 2008R t7 AR OAATHE PA 200ER4 7 PA 200RR47 Standard camera image Retardation KFAR data Standard camera image Retardation A data Retar
9. ving power of the final lens AY hIAVYALYA HKFETIADALYA Lens for smartphone Lens for optical pickup measured a WPA 100 S PZN Film BAI 7 LL OME DnA EET HH ONAT HE MAEAMT F RRLUV AZ Standard camera image Retardation distribution data Range expanded measured with WPA 100 S measured with WPA 200 L 18H F 4 T Transparent tube LRA ERRGEIAL SNS HEWRUICASAMOBWF 1 JOSAH Retardation distribution data of industrial medical transparent tube is abtained HEETE Eae fat AB AA IEM Plastic tube Plastic tube after straining i ONAT HR UAT F 18 ONATHR uHz AhT F Standard camera image Retardation distribution data Standard camera image Retardation distribution data measured with WPA 200 measured with WPA 200 I REA Inorganic material I 4444 Organic macromolecule GRE CH BALI ANART HE CART FEBE a DAEGU LO RHEL ATA ETH WPA micro Pl micro ket JAARNTO AAE MEn Distribution data of the crystal orientation is obtained easily TARET Reflection measurement is possible by WPA micro and PI micro Retardation distribution data is useful for the evaluation of the molecular orientation of Organic macromolecule like s late stals PJA Amphibole BE OnA He NSA Standard camera image aa distribution data measured with WPA micro EEIE WPA micro lt m Product Lineup WPA 200 WPA 200 L WPA 100 S WPA micro P29 DARL UY aA BU Sensor Wide range Type Polarization Imaging Sensor Ee 9 11 AB
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