Vol.29, No.4(2010
Contents
1.2. 1 Validation In Thermal Analysis METTLER TOLEDO 2008 2 Analytical Measurement Terminology Royal Society of Chemistry UK 2000 BN 0 85404 443 4 3 ISO 5725 Accuracy trueness and precision of measurerment metnods and resultS 4 SPM
3. RR 5 110
4. DSC National Insttute of 110 Standards and echnology NIST 28 5 0 19J q 0 65 DSC UIS56 6C 1932
5. 2 Ch
6. DSC TGA TMA DMA 2 amp B 1 Ci A 1
7. DMA Richardson DIN 53765 ASTM E1356
8. 1 100 DSC 1 28 45 g ea 0 12J g Ci amp 2
9. 1 0 TMA
10. DMA DSC IT 10K min amp
11. a h b h a b 6 d ss 9 3 h 110 gi g
12. 3 Round Robin
13. GA 0
14. CC 20 PPE Ve PA DSC TGA IMA DMA
15. DSC IMA DMA SF SFI DS NMR 4 DSC SFI NMR DSC SF GO CLE CD EE 0 8 8 8 8 8 8 8 DS 10
16. 110 1 110 QF ee PMP
17. 0 1 NST 1J g 0 19J 9 56 6C 273 16K G
18. DMA 1 865mm 110 1 90mm 5 79 35 m 0 5 Frirmary sample
19. 10 CO DMA DMASDTA861 DSC
20. CENTER OF ADVANCED INSTRUMENTAL ANALYSIS 110 sample values quantty Mean value B and standard Haviatinn nf the sample walues true value A bas sysiemalc deviation 1 p qi Ci B 1 TGA
21. U2 PVURh GA DSC 18
22. a i b c d Increasing ocuey Precision _ 2 1 DSC J g 100 10K min 1 TMA 3 30C 10
23. 2 201 Agilent Technologies 5500 Scanning Probe Microscope SPM 0 Atomic Force Microscopy AFM Sa ll Kelvin probe Force Microscopy KFM Umle URI NN nm PMP 00eie DS A 2 KFM DVD 876 Um DM 50 0 U 0 12 000 23 000 1 1 4 A
24. Q and A RI RS BOO 820 ll r816 8580 6 1 TEL 092 583 870 FAX 092 593 842 1 Re ae US T819 0395 744 TEL 092 802 2857 FAX 092 802 2858 110 22 10 25
25. http wWww bunseki cstm kyushu u ac jp
26. Pa Composite SITilE 5 EC TIHaTy ITIIBE Lahnratnry gglsl Test Grinding ancdor E Feducton Test portion 5 110 56 1 1
27. 47 182um 0 33um 0 04 0 012um 0 0016 0 33 m 0 012 m 9 O 6 Measurement 3 10 TMA 30C 10 0 33 um 0 012 m amp
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