クロックジッタの定義と測定方法
Contents
1. SiTime 10 000 5 10 0002. 5 25 4 10 000 1 25 RMS 3 SiT8102 125MH 3 3V Wavecrest SIA 4000C 4 10 000 The S
3. 1Gbps 40Gbps 9
4. Sampling Points Figure 9 Sampling of a signal by a digital scope The Smart Timing Choice 11 Si T AN10007 Rev 1 2 J 1 1 Si i TM l mMm e Clock Jitter Definitions and Measurement Methods 411 ADC 0 35 min risetime falltime Bandwidth 5
5. fc 2 6 f1 f2 The Smart Timing Choice 7 SiT AN10007 Rev 1 2 J 1 1 Si i TM l mMm e Clock Jitter Definitions and Measurement Methods Phase Noise N dBc Hz x Carrier 10MHz 1MHz 1000 100 Frequency 100 1000 100k 1MHz 10MHz fc Figure 6 Phase noise plot f1 f2 RMS 3 f2 PN f 2 10 0 df RMS Phase Jitter X xt 3 C f2 PN f 10 df fc f f2 PLL RMS
6. e 637 kHz 10 MHz e 10Gigabit Ethernet XAUI 1 875 MHz 20 MHz e SATA SAS 900 kHz 7 5 MHz H 1 RMS 2 dm ifo 10 df RMS Phase Jitter filtered 4 The Smart Timing Choice 8 Si T AN10007 Rev 1 2 J 1 1 Si i TM l mMm e Clock Jitter Definitions and Measurement Methods 3 TE TE TIE S pS 7 TIE l Ideal Signal Actual Signal Actual Loca
7. 4 990 pS Period Changee 5 990 pS 1010 DS 20 pS Clock Period The Smart Timing Choice 9 Si T AN10007 Rev 1 2 J 1 1 Si i TM l mMm e Clock Jitter Definitions and Measurement Methods Time Interval Error TIE 4 10 pS 40 pS 10 pS 5 DR
8. 4 1 4 3 25 SiTime The Smart Timing Choice 12 Si T AN10007 Rev 1 2 J 1 1 Si i TM l mMm e Clock Jitter Definitions and Measurement Methods 4 2 4 2 1 A 1
9. 1 Clock Jitter wi Ideal Clock A f X f AF Clock with jitter Data setup time Figure 1 Data setup violation caused by clock jitter Data Clock samples data before It is valid 2nS 1 5 nS 0 5 nS 2 Clock Jitter Ideal Clock d Af Nf NX fix Clock with jitter Data hold time i requirement Clock samples data with insufficient hold time Figure 2 Data hold time violation caused by clock jitter The Smart Timing Choice 2 SiT AN10007 Rev 1 2 J 1 1 Si i TM l mMm e Clock Jitter Definitions and Measurement Methods 2 1 2 RMS
10. B 1 2 T n N NxT nS 3 50 1 000 10 000 4 5 10 6
11. 7 213 8 3 4 25 25 Long term jitter at 50 signal crossing Figure 10 Long term jitter The Smart Timing Choice 14 Si T AN10007 Rev 1 2 J 1 1 Si i TM l mMm e Clock Jitter Definitions and Measurement Methods 5 2 1 2
12. 1 10 000 2 1 3 5 2 4 25 25 Ses uendere 4 2 2 1 2 C2C
13. 2 10 000 100MHz 10 000 100 uS 10 1008 3 4 2 1 3 5 2 3 25 25 B JEDEC 1
14. o Errorrus 2 J 2N N On RM 10 000 ErrorMs 0 0071 on 3 Errorrmus 10 000 RMS 10 pS Errorus 0 071 pS RMS 10 0 213 pS x 10 000 Errorkwua 10 000 RMS
15. 6 25 6 25 4 25 66 pS 21 22 pS 25 66 ps File Control Setup Trigger Measure Analyze Utilities Help 4 Mar 2009 4 51 AM Acquisition is stopped 20 0 GSars 1 00 kpts 3 inl I m is Measurement Cyc cyc jitr 3 Mean 48 89 fs j 30 fs Hits 1 021 khits Y Scale 1 hits Std Dev 7 37039 ps 2 26 ps Peak 9 hits Y Offset hits u zlo 68 6 4G 09 DS x scale 10 00 ps uz20 97 25 in 25 66 ps x position 2 22 ps u 3g 99 6 21 22 ps x Figure 4 Cycle to cycle jitter histogram The Smart Timing Choice 6 SiT AN10007 Rev 1 2 J 1 1 Si i TM l mMm e Clock Jitter Definitions and Measurement Methods 2
16. DpS RMS 2 2 1 SiTime 2 T1 T2 T1 T2 1 000 1 000 2 1 000 The Smart Timing Choice 5 SiT AN10007 Rev 1 2 J 1 1 Ion m ce Ies Si i TM l mMm e Clock Jitter Definitions and Measurement Methods 6 25
17. 1 000 1 000 25 EC NAANA Figure 5 Measuring a 10 000 clock cycle time interval 5 2 4 20kHz 60dBc Hz 10MHz 95dBc Hz
18. TIE TIE CDR PLL EBORE EODD N 1010 pS de ELLE I I EE I I i I I I I I 1 t 3 51753 Clock Period os o 5 990 pS 4 Oi O OOOO 40 DS 40 pS 20 pS 20 pS Figure 8 Time interval error TIE plot The Smart Timing Choice 10 Si T AN10007 Rev 1 2 J 1 1 Si i TM l mMm e Clock Jitter Definitions and Measurement Methods 4 4 1
19. 1 ADC 4 1 3 SiTime 20 80 3 20 80 1 nS 4 4 Gsps
20. 2 2 3 1 000 4 C2C 1 000 1 000 b 2 1 3 6 2 5 25 25 The Smart Timing Ch
21. RMS Pk Pk mg 100MHz 10 nN 9 998 n8 The Smart Timing Choice 1 Si T AN10007 Rev 1 2 J 1 1 Si i TM l mMm e Clock Jitter Definitions and Measurement Methods 2 1 1 1 uS 1 5 nS
22. SiTime Corporation 990 Almanor Avenue Sunnyvale CA 94085 USA Phone 408 328 4400 http www sitime com SiTime Corporation 2008 2014 The information contained herein is subject to change at any time without notice SiTime assumes no responsibility or liability for any loss damage or defect of a Product which is caused in whole or in part by i use of any circuitry other than circuitry embodied in a SiTime product ii misuse or abuse including static discharge neglect or accident iii unauthorized modification or repairs which have been soldered or altered during assembly and are not capable of being tested by SiTime under its normal test conditions or iv improper installation storage handling warehousing or transportation or v being subjected to unusual physical thermal or electrical stress Disclaimer SiTime makes no warranty of any kind express or implied with regard to this material and specifically disclaims any and all express or implied warranties either in fact or by operation of law statutory or otherwise including the implied warranties of merchantability and fitness for use or a particular purpose and any implied warranty arising from course of dealing or usage of trade as well as any common law duties relating to accuracy or lack of negligence with respect to this material any SiTime product and any product documentation Products sold by SiTime are not suitable or intended to be used i
23. RMS pS 10 000 Y RMS Peak to peak period jitter 7 44 x RMS jitter 1 RMS 3 pS 11 16 pS 1 1 100 99 2 327 1 SiTime RMS JEDEC 10 000 Sample Size Sigma 0 10 000 100 000 1 000 000 10 000 000 100 000 000 1 000 000 000 10 000 000 000 100 000 000 000 Table 1
24. ADC 4 1 2 RLE ADC SiTime
25. Gaussian probability density function PDF 2 1 3 JEDEC 65B 10000 SiTime 1 10 000 10 000 oq 5 25 proe E The Smart Timing Choice 3 Si T AN10007 Rev 1 2 J 1 1 Si i TM l mMm e Clock Jitter Definitions and Measurement Methods 10 000 qo RMS RMS
26. Si i ri e January 2014 1 2 TIE 2
27. mart Timing Choice 4 Si T AN10007 Rev 1 2 J 1 1 Clock Jitter Definitions and Measurement Methods 23 000Hits RMS 2 57pS Pk Pk 20 35pS 10 000 samples Figure 3 Histogram of 10 000 period jitter measurements 2 C2C JEDEC 65B 1 000 2 pS
28. n a life support application or component to operate nuclear facilities or in other mission critical applications where human life may be involved or at stake The Smart Timing Choice 15 Si T AN10007 Rev 1 2 J 1 1
29. oice 13 Si T AN10007 Rev 1 2 J 1 1 Si i TM l mMm e Clock Jitter Definitions and Measurement Methods 4 2 3 A N 1 N 2 1 N 1 3 1 000 4 1 000 5 213 6 1 4 25 25
30. tion P of the edge T1 T2 Ideal Location TIE T2 T1 of the edge Heference Edge Figure 7 Measuring the TIE of an edge 3 1 TIE 8 1000 pS Clock Period 990 pS 1010 pS Period Change
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