有価陶磁器に対する 人工物メトリクス適用のための研究
Contents
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5. ABSTRACT The authors propose a new method in which the fact that a porcelaim product is actually produced by the brand holder company The material used in this method is transparent the color tone created by the master artisan are not affected As the material is applied on to the product in the process of enameling or glazing no additional work process is required Furthermore because the method does not require UV or radioactive rays in registration and Verification of products potential hazards to the human body or product are eliminated The authors also indicate high feasibility by showing results of the elementary experiments showing results of the elementary experiments 1
6. 1 1 3 8 3 4 Crushing the raw materials Cleaning and mixing Forming Bisque firing painting pouring Glazing dipping or spraying 4 Firing 3 Dipping Painting Time line 0 W 8 Painting Firing Biscuit Glazed 1250 8
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8. 1 2 1 Dipping 10 5 5 3 8 1230 5 5
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10. 2 2 3 Copyright c USHIO INC All Right Reserved I No 40 2014 3 2013 2013 10 4 5 1 Artifact metrics
11. 1 10 5 2 15 4 3 1 10 4 2 1 2 7 808nm
12. Copyright c USHIO INC All Right Reserved I No 40 2014 3 2013 2013 10 j 6
13. Copyright c USHIO INC All Right Reserved No 40 2014 3 2013 2013 10 1
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15. 6 6 50 Copyright c USHIO INC All Right Reserved No 40 2014 3 2013 2013 10 0 64 0 24 0 456 2 0 4 0 5
16. 1 1kg 1kg 333 129 0 094g 31 3 RFID 1 80 120 RFID 1kg 100g g
17. 4 1 5 Artifact metrics System FS Peculiar Pattern 1 MO EE Extracting Ut nit or Artifact to be 4 1 Verification Result Referen Ce ss Data
18. 5 1 4 Web 5 5 3 1 5 20mm 0 08mm 1 50mm 3mm 22g 20mm 0 08mm 0 094g
19. 8 8 1 81 5 2 2 5 1 3 5 1 4
20. No 40 2014 3 2013 2013 10 Study of the New Artifact metrics for Valuable Porcelain Masaki Fujikawa Fumihiko Oda Kengo Moriyasu Shingo Fuchi3 Yoshikazu Takeda 1Sohgo Security Services Co Ltd USHIO Inc 3Aoyama Gakuin Univ Nagoya Univ
21. 3 4 Copyright c USHIO INC All Right Reserved No 40 2014 3 2013 2013 10 3 3 1 1 2 1 000nm 6
22. M CG InGaAs IR85 RG830 1 0 8 6 06 So 04 ee 9 03 5 0 subjectNo 1 No50 InGaAs Camera
23. 2013 2013 10 gt 3 3 4 1
24. 4 1 MeissenPorcelain com Meissen Porcelain Reproductions and Fakes http meissenporcelain Ccom meissen porcelain reprodu ctions 2013 07 01 2 Marion L Fake Porcelain Marks Recognizing Forged or imitation Marks on Ceramics http www worthpoint com blog e ntry fake porcelain marks recognizing forged or imitation mark S ceramics 2013 07 01
25. 4 3 1 2 2 4 1 1 5 10 Dipping Painting
26. Cee gt Accept Reject asubject of registration i and verification Reference Data Generating Unit Registration Phase Verification Phase 1 2 4 1
27. 00 900 0 PO After dried 1300 C 4 Bisque firing 1 4 1 3 Dipping Painting Firing Copyright c USHIO INC All Right Reserved No 40 2014 3
28. 25 20 Laser light IR transparent flter 15 Dark room environment 0 0 1 0 1 0 2 0 2 0 3 0 3 0 4 0 4 0 5 0 5 0 6 0 6 0 7 0 7 0 8 0 8 0 9 0 9 1 0 Correct Answer Rate 7 1 Copyright c USHIO INC All Right Reserved No 40 2014 3 2013 2013 10 8 No 1 9 No 2 No 5 5 5 1 5 1 1 1 2
29. 3 JNEWS com http www jnews com business digest 2007 012 html 2013 07 01 4 Yamakoshi M Rong X and Matsumoto T Anartifact metrics which utilizes laser speckle patterns for plastic ID card surface Proc SPIE 7618 76180B 2010 doi 10 1117 12 842237 5 Matsumoto H Takeuchi 1 Hoshino H Sugahara and Matsumoto T An Artifact Metric System Which UtilizesInherent Texture IPSJ Journal 42 8 IPSJ 2001 pp 139 152 6 Fuchi S Sakano A Takeda Y Wideband Infrared Emission from Yb3 and Nd3 Doped Bi203 B203 Glass Phosphor for an Optical Coherence Tomography Light Source Japanese Journal of Applied Physics pp 7932 7935 2008 7 pp 144 146 1998 8 2009 7 pp 147 Copyright c USHIO INC All Right Reserved
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