D750Ex Electrical Troubleshooting Procedure
Contents
1. 7 Verify visually that none of the surrounding pins have been damaged and that the replacement pogo pins have been seated fully Power up the Test Head Dock the HZI to the Handler Install the Continuity Probe Card and verify that the HZI passes continuity If the Checker still fails verify that the vacuum seal connecting the HZI interface to the Test Head is properly sealed a Remove the probe card undock the HZI interface from the handler lower the test head to the lower hard stop and move the test head to the service position b Check the vacuum gauges to verify that the vacuum seal is secure allowing the test head pins c Turn off vacuum pressure raise HZI interface off of the DIB interface reseat HZI interface and turn back on vacuum pressure Check vacuum gauges to ensure proper seal d Re run continuity using probe card and verify 1f failures are still present If the failures are random repeat this test again If the Checker still fails verify whether the fault is in the Interface or on the D750Ex instrument board a Remove the probe card undock the HZI interface from the handler lower the test head to the lower hard stop and move the test head to the service position Turn off the vacuum and remove the HZI interface from the test head Verify that the daughter card is installed and seated correctly on the HZI interface Inspect the pogo pins on the D750Ex boards and verify no pins are bent or damaged e Run system level continu2. 8 Power down the Test Head 9 Locate the failing pin on the HZI interface reference Figure 3 LCD HZI Pogo Ring Pin Location and replace the failing pogo pins Make sure to use the correct part number LCD or HSD If the failing pin is bent or appears OK use the needle nose pliers or the pogo pin replacement a tool to remove the pin When pulling pin out pin be careful not to shear pin b Ifthe failing pin is sheared use the tool in the pogo pin replacement kit to remove the sheared pin Figure 3 LCD HZI Pogo Ring Pin Location Pogo Tower Configuration Bs Column z meane 176 99233600 SSSOG COR ap AKIE SSseeoeodea st p eae a a 42 tes ec te ne ee Y 43 1 Win one enenee Q segeonedsaveres ctin Gbecccssadecgans 7 o i Ff gusteeqonesse 44 cl ppesenncnpnoscegs pr 2 E E a Ce i ee e 5 m aa g AN eji anamen s amp ores 47 as DU 40 orien em lt Tester Head Front View Direction Probe Card Front Needle J ee ae ee nR Tobe Card GND LCD Analog GND GND _ HSD GND FRINxx DPS GND FEND apmu GND 1 HSD CH446 and CH447 is reserved for the Malabar back plan signal GND Utility GND Can t use for the application APMU The Sense line for APMU CH1 2 9 9 10 11 17 18 19 25 26 27 33 34 35 41 42 43 49 50 51 57 58 59 only exist when use the new version of APMU Mike Smith Page 3 9 17 2008 10 11 12 13 14 iD 16 1
3. D750Ex Electrical Troubleshooting Procedure Date Created 7 18 08 Tools Required o Continuity Probe Card 603 783 00 Recommended Tools o Teradyne Field Service Kit PN 1 HZI Assembly Stand Breakout Board Cable Carrier Removal Tool GnTEST PN 65496 Cardlet Install Removal Tool GnTEST PN 65497 Pogo Pin Replacement Tool nTEST PN 65528 LCD Spring Pin Kit 603 98 1 00 HSD Spring Pin Kit 603 982 00 ee la Figure 1 Reference Figure for D750Ex Test Cell Hardware LCD HZI Continuity Probe Card Mike Smith Page 1 9 17 2008 D750Ex Test Cell Electrical Troubleshooting Procedure General Troubleshooting Use this Procedure to assist in troubleshooting electrical failures on the HZI interface down to the FRU level 1 Customer has a fault while running the device program 2 Undock and remove the customer s probe card 3 Install the Teradyne Continuity Probe Card part number 601 312 00 onto the HZI Test Cell and dock the probe card using the Handler or the hand test fixture 4 Run the LCD Continuity Probe Checker to identify the location of the failing pins See Figure 2 LCD Continuity Probe Checker Error Code Add in Error Code displayed by checker Record the location of the failing pins or pair of pins For example from Figure 2 below the failure is occurring on the DPS The pin s that are failing are located on the top of the HZI interface at column 114 row R17 Note If there are no errors
4. ity to verify whether the fault is within the system or the interface If the system level continuity fails then the problem is within the D750Ex system Troubleshoot the system and the boards If the system level continuity passes then the issue is likely in the HZI interface Refer to the section Internal HZI Troubleshooting a p Internal HZI Troubleshooting Se a Remove the probe card Undock the HZI interface from the handler Lower the test head to the lower hard stop and move the test head to the service position Turn off the vacuum and power down the test head Remove the HZI interface from the test head Place HZI Unit on stand The unit must be raised above the cross members and then placed on the cross bars See the Figure 4 HZI Stand Add Figure 4 HZI Stand Locate the failing pins and cable locations using Figure HZI Pogo Ring Pin Location Verify that the cardlets are seated correctly in the pogo ring If the cardlets are not seated reseat the cardlets and rerun the probe continuity tests Using a multimeter and the wiring diagram locate the failing pin and associated location on the HIB Check continuity and verify there is continuity through the HZI See Figure 5 Multimeter check Add Figure 5 Multimeter Check a If you are not getting continuity through the HZI interface there could be an issue with seating the carrier connector with the cable assembly or with the HIB b If you are getting continuity thr
5. ough the HZI interface then the HZI unit is likely OK but the failures could be caused by an alignment issue seating issue or mechanical issue with not compressing the pins enough Figure 5 Multimeter Check Mike Smith Page 4 9 17 2008 10 Using the procedure in the FRU replacement manual open the enclosure and trace the cables down to the appropriate carrier connector You can also reference the figure HIB carrier connector locations to identify the J location on the HIB 11 Verify that the carrier assemblies are seated correctly on the HIB If the carrier connectors are not seated properly reseat them and rerun the probe continuity test 12 If the failure is still occurring remove the appropriate carrier connector from the HIB frame Install the carrier connector into the breakout board and verify there is continuity within the cable assembly See Figure 6 Continuity Check w Breakout Board a If continuity fails use the HZI FRU replacement procedure to replace the failing cable and re run continuity b If continuity passes the failure is likely in the HIB Figure 6 Continuity Check w Breakout Board Perform Continuity Test on all the Cable Assemblies Fig 5 9 29 Fig 5 9 30 13 Using the multimeter verify continuity between the underside of the HIB and the pins that the carrier connector connects to a If continuity between the HIB fails replace the HZI interface the HIB is not a FRU b If con
6. shown when using the Continuity Probe Card but errors reappear when the customers probe card is reinstalled then the error is likely either in the customer s probe card or in the device program Using the continuity probe card can assist in identifying continuity issues due to tester HZI it provides coverage for LCD AMPU DPS Cal Cub and HSD channels and signals or due to alignment issues when docking the test head to the handler provides positional pogo accuracy By using the continuity probe card you can rule out these issues if continuity passes when docked to the handler and you can focus the troubleshooting efforts on the probe card and device program Figure 2 LCD Continuity Probe Checker Error Code Gh Teradyne_IG XL_DataCollect_0 Microsoft Word i File Edit View Insert Format Tools Table Window Help MEEA BEIE MIA 100 gt Read Datalog report 06 06 2008 06 48 44 Prog Name ContactCheck xls Job Name Continuity Lot Operator Test Mode Node Name PS5G512 Part Type Channel map CM dps0 Environment Site Number 0 Device 21 Number Site Result High 47 5mi 49 9mi 52 5ma 47 5mi 49 7m 52 5ma 47 5mai 49 7 mi 52 5ma 47 5mi 49 7mi 52 5ma 47 5mi 49 7mi 52 5ma Ln 12 Col 1 5 Undock and remove the Continuity Probe Card 6 Undock the HZI interface from the Handler Mike Smith Page 2 9 17 2008 Lower the Test Head to the Lower Hard Stop and move the Test Head to the service position T
7. tinuity passes re install the cable assembly and check continuity through the interface again underside of HIB to pogo pin in pogo ring 14 Install HZI interface onto the test head and power up the test head Verify that the vacuum seal is properly sealed 15 Using the LKT cart move the Test Head to the Docking position and dock the HZI to the handler 16 Install the Continuity Probe Card and verify that the HZI passes continuity 17 If continuity still fails replace the HZI interface Mike Smith Page 5 9 17 2008
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